View detail for Atmel AT11008: Migration from ATxmega16D4/32D4 Revision E to Revision I

APPLICATION NOTE
AT11008: Migration from ATxmega16D4/32D4 Revision E
to Revision I
Atmel AVR XMEGA
Introduction
This application note lists out the differences and changes between Revision E
®
and Revision I of Atmel ATxmega16D4/32D4 devices.
For complete device details, always refer to the most recent version of the
®
ATxmega16D4/32D4 datasheet and the Atmel XMEGA D manual. Errata
differences are not listed in this document, only in the device datasheet.
In addition to the differences described in this document, other typical
characteristics could be different. Check the latest datasheets for details.
The new configuration options and functions available in Revision I of
ATxmega16D4/32D4 are a superset of existing functions, and this means that
existing code for these revisions will work on the new revision without changing
existing configuration or enabling new functions.
Features
• Enhancements and added functions
• Memories
• System clock and clock options
• Reset system
• I/O ports
• Registers
• Changes in electrical characteristics
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Enhancements and Added Functions
In this chapter, we summarize the list of enhancements or added features available in the Revision I of the Atmel
ATxmega16D4/32D4.
1.1
Clock System
•
•
•
•
•
•
Alternate pin location for TOSC1 and TOSC2 pins for 32.768kHz crystal connection on devices with shared
TOSC and XTAL location
A divide-by-two option for the PLL output that enables output frequency down to 10MHz
PLL lock failure detection with optionally Non-Maskable Interrupt (NMI), for improved safety and
robustness
Non-prescaled Real Time Counter clock source options: External clock from TOSC1, 32.768kHz from
TOSC, and the 32.768kHz from the 32.768kHz internal oscillator
Higher drive option for external crystal oscillator to support crystals with higher load
The 32MHz internal oscillator can be tuned to run at any frequency between 30MHz and 55MHz
1.2
I/O Ports
1.3
Two-wire Interface
1.4
Analog to Digital Converter
1.5
Analog Comparator
1.6
CRC16/CRC32 Generator
1.7
16-bit Timer/Counter 0
1.8
High Resolution Extension
1.9
Power Management
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AT11008: Migration from ATxmega16D4/32D4 Revision E to Revision I [APPLICATION NOTE]
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•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
Alternate pin locations for Timer/Counter 0 Compare Channels, USART0 and SPI
Alternate pin locations for the Peripheral Clock and Event output functions
The Real Time Counter clock can be output to a port pin
Any Event Channel can be output to a port pin
The SDA Hold time can be increased and configured in order to be SMBUS compliant
Automatic input channel scan
VCC/2 voltage reference option
1/2x (divide-by-two) gain stage setting
Internal Ground can be used as negative input in differential mode with and without gain
Sample time is configurable
Analog Comparator 1 can be output on a port pin
A constant current source
®
A CRC16/CRC32 Generator Module that supports CRC16 (RC-CCITT) and CRC-32 (IEEE 802.3)
Split mode that enable two 8-bit Timer/Counters with four PWM channels each
Hi-Res+ option to allow PWM resolution to be increased with 8x (3-bit)
Possibility to enable sequential start of the components used for analog modules ADC and Analog
Comparator in order to reduce start-up current
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Memories
2.1
NVM Controller
For Atmel ATxmega16D4/32D4 Revision E devices, the chip erase time is about 40ms. The chip erase time of
ATxmega32D4/16/D4 Revision I is longer.
The typical chip erase time of ATxmega16D4/32D4 Revision I are listed in Table 2-1.
Table 2-1.
ATxmega16D4/32D4 Revision E Chip Erase Time
Product
Flash and Boot Code Size
Chip Erase Time
ATxmega16D4
16KB + 4KB
45ms
ATxmega32D4
32KB + 4KB
50ms
To ensure that the flash chip erase is finished correctly, no flash access should be done during the chip erase
time.
In the user code, it is always needed to check the FBUSY bit in the Non-Volatile Memory Status Register to see
when the chip erase is finished.
CRC32 is automatically used instead of existing CRC module if the new CRC16/CRC32 module is enabled.
There is no change in the commands.
2.2
Fuses and Lock Bits
BOD levels are different in ATxmega16D4/32D4 Revision I. See Section 4.1 Brown-out Detection for the
differences.
3
System Clock and Clock Options
3.1
Clock Failure
The PLLDFIF flag, indicating if the PLL looses lock, is no longer automatically cleared, but must be done from
software.
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4
Reset System
4.1
Brown-out Detection
The programmable BODLEVEL settings are different in ATxmega16D4/32D4 Revision I. See Table 4-1 for
details. Refer to the device datasheet regarding tolerance for the brown-out levels.
Table 4-1.
Brown-out Levels
BODLEVEL
VBOT – Revision E
VBOT – Revision I
111
1.63V
1.6 V
110
1.9V
1.8 V
101
2.17V
2.0 V
100
2.43V
2.2 V
011
2.68V
2.4 V
010
2.96V
2.6 V
001
3.22V
2.8 V
000
3.49V
3.0 V
For devices until Revision E, the BOD is forced on for all Non-Volatile Memory (NVM) programming. For the new
Revision I, the BOD is only forced on during chip erase and when the PDI is enabled. For other NVM
programming operations, the POR threshold voltage (V POT+) is the limit for aborting.
5
I/O Ports
The I/O port pins are LV-TTL and LVCOMS compatible for Atmel ATxmega16D4/32D4 Revision I. The minimum
“Input High Voltage” is never higher than 2.0V for VCC > 2.7V.
In ATxmega16D4/32D4 Revision E, the minimum “Input High Voltage” is 0.7VCC, and could be higher than 2.0V
for VCC > 2.86V.
5.1
I/O Pin Behavior when Disabling TX in USART
When the transmitter is disabled in USART peripheral, it will no longer override the TxDn pin, and the pin
direction is set as input automatically by hardware, even if it was configured as output by the user. This behavior
as mentioned in the XMEGA D manual is valid from Revision I. In the previous revisions, the pin direction does
not get changed to input automatically.
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Registers
6.1
Added Registers and Bits
Table 6-1 lists the registers and bits, which has been added in the ATxmega16D4/32D4 Revision I.
Table 6-1.
Register Bits and Functionality added in the ATxmega16D4/32D4 Revision I
Register Name
Bit
Function
SAMPCTRL
Bit[5:0] - SAMPVAL[5:0]
Sampling time control register
The SAMPVAL bits control the ADC sampling time in number of half ADC prescaled clock cycles (depends on
ADC_PRESCALER value), thus controlling the ADC input impedance. Sampling time is set according to the
formula:
Sampling time = (SAMPVAL+1)*(ClkADC/2)
6.2
Removed Registers and Bits
Table 6-2 lists the registers and bits, which exist in devices until Atmel ATxmega16D4/32D4 revision E but not in
ATxmega16D4/32D4 Revision I.
Table 6-2.
6.3
Register Bits and Functionality that does not exist in ATxmega16D4/32D4 Revision I
Register Name
Bit
Function
COMP0
COMP[7:0]
Oscillator Compare Register 0
CALH Register Not Applicable
For the ATxmega16D4/32D4 Revision I, CALH is not applicable hence it cannot be written. When read, the
CALH register will return zero. This new design ATxmega16D4/32D4 ADC requires only one calibration byte
(only 8 bit value not 12 bit value). For code compatibility with the earlier revisions, dependent registers like CALH,
CALL, ADC CAL0, and ADC CAL1 has been kept same as the older design.
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6.4
MUXNEG Configurations in ADC Channel MUX Control Register
In the Revision E of the ATxmega16D4/32D4 devices, Bit 2 of the MUXNEG configuration in ADC Channel MUX
Control registers is reserved. This bit is now available for configuration in the Revision I.
Below are the configurations available in the older and latest revision:
Revision E:
Bit
7
+0x01
-
Read/Write
R
R/W
R/W
R/W
R/W
R
R/W
R/W
Initial Value
0
0
0
0
0
0
0
0
Table 6-3.
Table 6-4.
6
6
5
4
3
MUXPOS[3:0]
2
1
-
0
MUXNEG[1:0]
MUXCTRL
ADC MUXNEG Configuration, INPUTMODE[1:0] = 10, Differential without Gain
MUXNEG[1:0]
Group Configuration
Analog Input
00
PIN0
ADC0 pin
01
PIN1
ADC1 pin
10
PIN2
ADC2 pin
11
PIN3
ADC3 pin
ADC MUXNEG Configuration, INPUTMODE[1:0] = 11, Differential with Gain
MUXNEG[1:0]
Group Configuration
Analog Input
00
PIN4
ADC4 pin
01
PIN5
ADC5 pin
10
PIN6
ADC6 pin
11
PIN7
ADC7 pin
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Revision I:
Bit
7
+0x01
-
Read/Write
R
R/W
R/W
R/W
R/W
R
R/W
R/W
Initial Value
0
0
0
0
0
0
0
0
Table 6-5.
Table 6-6.
6
5
4
3
2
MUXPOS[3:0]
1
0
MUXNEG[2:0]
ADC MUXNEG Configuration, INPUTMODE[1:0] = 10, Differential without Gain
MUXNEG[2:0]
Group Configuration
Analog Input
000
PIN0
ADC0 pin
001
PIN1
ADC1 pin
010
PIN2
ADC2 pin
011
PIN3
ADC3 pin
100
-
Reserved
101
GND
PAD ground
110
-
Reserved
111
INTGND
Internal ground
ADC MUXNEG Configuration, INPUTMODE[1:0] = 11, Differential with Gain
MUXNEG[2:0]
Group Configuration
Analog Input
000
PIN4
ADC4 pin
001
PIN5
ADC5 pin
010
PIN6
ADC6 pin
011
PIN7
ADC7 pin
100
INTGND
Initial ground
101
-
Reserved
110
-
Reserved
111
GND
PAD ground
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Changes in Electrical Characteristics
7.1
Reduced Current Consumption in Active and Idle Mode
Table 7-1 lists the typical and maximum current consumption in the Revision E and Revision I.
Table 7-1.
Current Consumption in Sleep Modes
Revision E
Parameter
Condition
32kHz, ext. clk.
1MHz, ext. clk.
Active power
consumption
2MHz, ext. clk.
32MHz, ext. clk.
32kHz, ext. clk.
Power-down
power consumption
Power-save
power consumption
Reset power
consumption
8
Typ.
Max.
Min.
Typ.
Max.
VCC = 1.8V
68
40
VCC = 3.0V
145
80
VCC = 1.8V
260
200
VCC = 3.0V
540
410
VCC = 1.8V
460
600
350
600
0.96
1.4
0.75
1.4
9.8
12
7.5
12
VCC = 3.0V
2.4
2
VCC = 3.0V
3.9
2.8
VCC = 1.8V
62
42
VCC = 3.0V
118
85
VCC = 1.8V
125
225
85
225
240
350
170
350
32MHz, ext. clk.
3.8
5.5
2.7
5.5
T = 25°C
0.1
1
0.1
1
1.2
4.5
2
4.5
WDT and sampled BOD
enabled, T = 25°C
1.3
3
1.4
3
WDT and sampled BOD
enabled, T = 85°C
2.4
6
3
6
2MHz, ext. clk.
T = 85°C
VCC = 3.0V
VCC = 1.8V
1.2
1.5
VCC = 3.0V
1.3
1.5
RTC from 1.024kHz low
power 32.768kHz TOSC,
T = 25°C
VCC = 1.8V
0.6
2
0.6
2
VCC = 3.0V
0.7
2
0.7
2
RTC from low power
32.768kHz TOSC,
T = 25°C
VCC = 1.8V
0.8
3
0.8
3
VCC = 3.0V
1
3
1
3
VCC = 3.0V
320
300
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mA
µA
RTC from ULP clock,
WDT and sampled BOD
enabled, T = 25°C
Current through RESET
pin subtracted
Units
µA
VCC = 1.8V
1MHz, ext. clk.
Idle power consumption
Min.
Revision I
mA
µA
7.2
Increased ADC Maximum Samples Rate
The maximum ADC clock frequency and sample rate is increased, as shown in Table 7-2.
Table 7-2.
ADC Characteristics
Revision E
7.3
Parameter
Min.
ADC clock frequency
ADC samples rate
Typ.
Revision I
Max.
Min.
100
1400
14
200
Typ.
Max.
Units
100
1800
kHz
16
300
kSPS
Typ.
Max.
Units
16
90
Reduced Analog Comparator Propagation Delay
The Analog Comparator propagation delay is reduced, as shown in Table 7-3.
Table 7-3.
Analog Comparator Characteristics
Revision E
7.4
Parameter
Condition
Propagation delay
Propagation delay
Min.
Revision I
Typ.
Max.
VCC = 3.0V, T = 85°C
30
90
VCC = 1.6 – 3.6V, T = 25°C
30
Min.
16
ns
32kHz Internal ULP Oscillator Frequency
The frequency of the 32kHz internal ULP oscillator is increased to match its nominal frequency with guaranteed
accuracy.
Table 7-4.
32kHz Internal ULP Oscillator Frequency
Revision E
Parameter
Condition
Min.
Factory calibrated frequency
Factory calibration accuracy
Accuracy
Typ.
Revision I
Max.
Min.
26
VCC = 3.0V, T = 85°C
Typ.
Max.
32
Units
kHz
na
na
-12
12
na
Na
-30
30
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Revision History
Doc Rev.
Date
42401A
02/2015
Comments
Initial document release.
AT11008: Migration from ATxmega16D4/32D4 Revision E to Revision I [APPLICATION NOTE]
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