Accelerated Life Test Data UTMC PROM FIT Rate Summary (W/ PPC) Test Units (w/ PPC II) 64K PROM (WO7430) 64K PROM (WO7430) 64K PROM (WO7430) 64K PROM (WO7430) 64K PROM (WO7430) Lot Number QS52561 QS52561 QS52561 QS52561 QS52561 AS20605 AS20606 AS22622 AS20605 256K PROM (0NYD) AS20606 AS22622 AS20605 256K PROM (0NYD) AS20606 AS22622 AS20605 256K PROM (0NYD) AS20606 AS22622 AS20605 256K PROM (0NYD) AS20606 AS22622 64K PROM (0NVXCGPC) AS13627 64K PROM (0NHK) AS13627 AS19696 256K PROM (0NVPRS) AS22633 AS20605 256K PROM (0NYD) AS20606 AS22622 64K PROM (WO7430) QS52561 AS20605 256K PROM (0NYD) AS20606 AS22622 256K PROM W07618 256K PROM W07618 256K PROM (0NYD) Units 114 114 136 136 Life Test Cummulative 64K PROM Device Hours Device Hours Bit Failures Life Test Hours at (55C equivalent) (Equivalent) 150C Hours at 150C 500.9 500 11968.74 1.36E+06 0 562.2 1063.1 13433.47 1.53E+06 0 504.1 1567.2 12045.20 1.64E+06 0 516.7 2083.9 12346.27 1.68E+06 0 136 1024.4 3108.3 24477.49 3.33E+06 1 161 258.1 258.1 6167.16 3.97E+06 0 161 279.8 537.9 6685.67 4.31E+06 0 138 518.1 1056 12379.72 6.83E+06 1 160 690.9 1746.9 16508.68 1.06E+07 0 160 211.8 1958.7 5060.85 3.24E+06 0 23 22 500.2 584.3 500.2 584.3 11952.01 13961.54 2.75E+05 3.07E+05 0 0 24 501.8 501.8 11990.24 1.15E+06 0 166 3371.8 6916.8 80567.35 5.35E+07 0 135 2636.4 5744.7 62995.36 8.50E+06 0 166 5173.7 12090.5 123622.79 8.21E+07 0 90 89 1082.2 3075.8 1082.2 4158 25858.59 73494.59 9.31E+06 2.62E+07 1 0 525515.72 2.20E+08 3 MTTF 8,356 years FIT (MLE) 14 MTTF 60% LCL 6,004 years FIT 60% UCL 19 Reliability Over Reliability Over 15 Years 15 Years MLE 60% LCL MTTF 2,089 MTTF 1,501 60% LCL Reliability Over Reliability Over years years FIT (MLE) FIT 60% UCL 15 Years 15 Years MLE 60% LCL 99.82% 99.75% 256K PROM FIT Rate Summary (W/ PPC II) Benedetto 7/23/99 *bin 14, noisy outputs, unrelated to antifuse *bin12, antifuse failure Total 64K PROM FIT Rate Summary (W/ PPC II) Comments 55 76 99.28% 99.01%