INFINEON BSP365

BSP 365
MiniSmart
• High-side switch
• Short-circuit protection
• Overtemperature protection with hysteresis
• Overload protection
• Overvoltage protection
• Reverse battery protection1)
• Switching inductive load
• Clamp of negative output voltage with inductive loads
• Maximum current internally limited
4
3
2
1
Package: SOT 223
Type
Pins:
1
IN
Ordering code
BSP 365
Q67050-M1
2
Vbb
3
OUT
4
Vbb
Maximum Ratings
Parameter
Supply voltage
Load current
self-limited
Maximum current through input pin (DC)
Symbol Values
Vbb
65
IL
IL(SC)
IIN
±15
Unit
V
A
mA
see internal circuit diagram
Inductive load switch-off energy dissipation
Operating temperature range
Storage temperature range
Max. power dissipation (DC)2)
TA = 25 °C
Thermal resistance
chip - soldering point:
chip - ambient:2)
EAS
Tj
Tstg
Ptot
RthJS
RthJA
5
-40 ...+150
-55 ...+150
1.7
17
72
+ V bb
Voltage
Overvoltage
Current
Gate
source
protection
limit
protection
mJ
°C
W
K/W
2/4
V Logic
Charge pump
Level shifter
Limit for
unclamped
ind. loads
Rectifier
OUT
Temperature
sensor
3
Load
Logic
ESD
R
in
MINI-PROFET
1
I IN
1)
2)
Load GND
For 12 V applications only. Reverse load current only limited by connected load.
BSP 365 on epoxy pcb 40 mm x 40 mm x 1.5 mm with 6 cm2 copper area for Vbb connection
Semiconductor Group
Page 1 of 6
05.03.96
BSP 365
Electrical Characteristics
Parameter and Conditions
Symbol
at Tj = 25 °C, Vbb = 24 V unless otherwise specified
min
Load Switching Capabilities and Characteristics
On-state resistance (pin 2 to 3)
IL = 100 mA, pin 1 = GND
Tj = 25°C
Tj = 150°C
IL = 50 mA, Vbb = 4,9 V, Tj = 25°C
Nominal load current (pin 2 to 3)
ISO Standard: VON = Vbb - VOUT = 0.5 V
TS = 85 °C
Turn-on time
to 90% VOUT
Turn-off time
to 10% VOUT
RL = 270 Ω
Slew rate on
10 to 30% VOUT, RL = 270 Ω
Slew rate off
70 to 40% VOUT, RL = 270 Ω
Input
Tj = - 40...+150°C
OFF state input current
RL = 270 Ω, VOUT ≤ 0,1V
ON state input current, (pin 1 grounded)3)
Tj = - 40...+150°C
4)
Unit
max
----
4
8
--
5
10
15
Ω
0.07
--
--
A
ton
toff
---
60
70
100
100
µs
dV /dton
--
4
6
V/µs
-dV/dtoff
--
2
6
IIN(off)
--
--
0.05
mA
IIN(on)
--
0.35
1
mA
4.9
--
60
V
---
1.2
--
10
60
µA
RON
IL(ISO)
Operating Parameters
Operating voltage (pin 1 grounded)4)
Vbb(on)
Tj = - 40...+150°C
Leakage current (pin 2 to 3, pin 1 open)
Ibb(off)
Tj = - 40...+150°C
Vbb = 60 V, Tj = - 40...+150°C
3)
Values
typ
Driver circuit must be capable to drive currents >1mA.
Below Vbb=4.5 V typ. without chargepump, V out ≈ Vbb - 2 V
Semiconductor Group
Page 2
05.03.96
BSP 365
Parameter and Conditions
Symbol
at Tj = 25 °C, Vbb = 24V unless otherwise specified
Protection Functions
Current limit (pin 2 to 3)5)
min
Tj = 25°C
Tj = -40...+150°
Thermal overload trip temperature
Thermal hysteresis
Overvoltage protection
Tj =-40...+150°C
Output clamp (ind. load switch off)
at VOUT = Vbb - VON(CL)
Inductive load switch-off energy dissipation6)
Reverse battery resistor (pin 1 to 2)
Reverse Diode
Continious reverse drain current
Pulsed reverse drain current
Diode forward on voltage
IF = 0.2 A, IIN = ≤ 0.05 mA
Tj = 25°C
Tj = 25°C
IL(SC)
Values
typ
0.2
0.2
150
-65
--
0.5
--10
72
EAS
RIN
IS
ISM
VSD
Tjt
∆Tjt
Vbbin(AZ)
VON(CL)
72
°C
K
V
V
---
-1
5
--
mJ
kΩ
----
--0.9
0.2
0.8
1.2
A
A
V
load current limits onset at IL * Ron approx. 1V
short circuit protection: combination of current limit and thermal overload switch off
6)
while demagnetizing load inductance, dissipated energy is EAS= ∫(VON(CL) * iL(t) dt,
V
2
approx. EAS= 1/2 * L * IL * ( V ON(CL)
)
ON(CL)-Vbb
Page 3
max
1
1.2
-----
5)
Semiconductor Group
Unit
A
05.03.96
BSP 365
Max allowable power dissipation
Ptot = f (TA,TSP)
Ptot [W]
8
Typ. on state resistance (Vbb- pin to OUT pin)
RON = f (Vbb); IL = 70 mA; Tj = 25°C
RON [Ω]
10
9
7
8
6
7
5
T
6
SP
4
5
4
3
3
2
2
TA
1
1
0
0
0
25
50
75
100
125
0
150
TA, TSP[°C]
5
10
15
20
25
Vbb [V]
On state resistance (Vbb- pin to OUT pin)
RON = f (Tj);Vbb = 13.5 V;IL = 70 mA
RON [Ω]
Typ. short circuit current
IL(SC) = f(Tj); Vbb = 13.5V
ILSC [Α]
10
0.6
9
0.5
8
7
0.4
98%
6
0.3
5
typ.
4
0.2
3
2
0.1
1
0
-50
-25
0
25
50
75
100
125
0
-50
150
TJ [°C]
Semiconductor Group
Page 4
-25
0
25
50
75
100
125
150
TJ [°C]
05.03.96
BSP 365
Test circuit
Typ. short circuit current
IL(SC) = f(VON); Vbb = 13.5V; Tj = 25°C
ILSC [Α]
Vbb
0.5
2/4
Von
3
0.4
Iin 1
Vout
Vin
0.3
0.2
Turn on conditions
0.1
0
0
2
4
6
8
10
VON [V]
Typ. short circuit current
IL(SC) = f(t); Vbb = 13.5V
no heatsink; Parameter: TjStart
IL(SC)[A]
0.6
0.5
0.4
0.3
-40°C
25°C
125°C
Chargepump threshold
VON = f (Vbb)
0.2
4
0.1
2
typ.
0
-2
0
2
4
6
8
10
12
14
t[s]
Semiconductor Group
max.
16
Page 5
2
4
6
8
05.03.96
BSP 365
Package:
all dimensions in mm.
SOT 223/3:
Edition 7.97
Published by Siemens AG,
Bereich Halbleiter Vetrieb,
Werbung, Balanstraße 73,
81541 München
© Siemens AG 1997
All Rights Reserved.
Attention please!
As far as patents or other rights of third parties are concerned, liability is only assumed for components, not for
applications, processes and circuits implemented within components or assemblies.
The information describes a type of component and shall not be considered as warranted characteristics.
Terms of delivery and rights to change design reserved.
For questions on technology, delivery and prices please contact the Semiconductor Group Offices in Germany or
the Siemens Companies and Representatives worldwide (see address list).
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question please contact your nearest Siemens Office, Semiconductor Group.
Siemens AG is an approved CECC manufacturer.
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1
Critical components of the Semiconductor Group of Siemens AG, may only be used in life-support devices or
2
systems with the express written approval of the Semiconductor Group of Siemens AG.
1) A critical component is a component used in a life-support device or system whose failure can reasonably be
expected to cause the failure of that life-support device or system, or to affect its safety or effectiveness of that
device or system.
2) Life support devices or systems are intended (a) to be implanted in the human body, or (b) to support and/or
maintain and sustain and/or protecf human life. If they fail, it is reasonable to assume that the health of the user or
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Semiconductor Group
Page 6
05.03.96