INFINEON TLE4997

_TLE4997I_Data_Sheet.book Page 1 Wednesday, August 22, 2007 12:59 PM
Data Sheet, V 1.0, June 2007
T LE4 99 7I
Programmable Linear Hall Sensor
for Industrial Use
Sensors
N e v e r
s t o p
t h i n k i n g .
_TLE4997I_Data_Sheet.book Page 2 Wednesday, August 22, 2007 12:59 PM
Edition 2007-06
Published by Infineon Technologies AG,
Am Campeon 1-12,
85579 Neubiberg, Germany
© Infineon Technologies AG 2007.
All Rights Reserved.
Attention please!
The information herein is given to describe certain components and shall not be considered as a guarantee of
characteristics.
Terms of delivery and rights to technical change reserved.
We hereby disclaim any and all warranties, including but not limited to warranties of non-infringement, regarding
circuits, descriptions and charts stated herein.
Information
For further information on technology, delivery terms and conditions and prices please contact your nearest
Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements components may contain dangerous substances. For information on the types in
question please contact your nearest Infineon Technologies Office.
Infineon Technologies Components may only be used in life-support devices or systems with the express written
approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure
of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support
devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain
and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may
be endangered.
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TLE4997I
Revision History:
2007-06
V 1.0
Previous Version:
Page
Subjects (major changes since last revision)
We Listen to Your Comments
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_TLE4997I_Data_Sheet.book Page 4 Wednesday, August 22, 2007 12:59 PM
TLE4997I
Table of Contents
Page
1
1.1
1.2
1.3
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Target Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
2
2.1
2.2
2.3
2.4
General . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Functional Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Principle of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10
Transfer Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
3
Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
4
Operating Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
5
Electrical and Magnetic Parameters . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
6
6.1
6.2
6.3
6.4
6.5
6.6
Signal Processing . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Magnetic Field Ranges . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Gain Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Offset Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DSP Input Low Pass Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
DAC Input Interpolation Filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Clamping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
17
18
19
19
20
22
23
7
7.1
7.2
7.3
Error Detection . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Voltages Outside the Operating Range . . . . . . . . . . . . . . . . . . . . . . . . . . .
Open Circuit of Supply Lines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Not Correctable EEPROM Errors . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
25
25
25
26
8
8.1
Temperature Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Parameter Calculation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 28
9
9.1
9.2
Calibration . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Calibration Data Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Programming Interface . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
10
Application Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
11
Package Outlines . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 33
12
Life Support Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Data Sheet
4
7
7
8
8
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TLE4997I
List of Figures
Figure 1
Figure 2
Figure 3
Figure 4
Figure 5
Figure 6
Figure 7
Figure 8
Figure 9
Figure 10
Figure 11
Data Sheet
Page
Pin Configuration and Hall Cell Location . . . . . . . . . . . . . . . . . . . . . . . . 8
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9
Examples of Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Ratiometry Error Band . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Signal Processing Flow . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
DSP Input Filter (Magnitude Plot) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
DAC Input Filter (Magnitude Plot) . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22
Clamping Example . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24
EEPROM Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Application Circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
PG-SSO-3-10 (Plastic Green Single Small Outline Package) . . . . . . . 33
5
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TLE4997I
List of Tables
Table 1
Table 2
Table 3
Table 4
Table 5
Table 6
Table 7
Table 8
Table 9
Table 10
Table 11
Table 12
Table 13
Table 14
Table 15
Table 16
Table 17
Table 18
Data Sheet
Page
Pin Definitions and Functions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Operating Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Magnetic Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 16
Range Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18
Gain . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Offset . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Low Pass Filter Setting . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Clamping . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 23
Undervoltage and Overvoltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
Open Circuit (OBD Parameters) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 25
EEPROM Error Signalling . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26
Temperature Compensation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27
Calibration Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29
Programming Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31
6
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Programmable Linear Hall Sensor
for Industrial Use
1
Overview
1.1
Features
TLE4997I
• High linear and ratiometric push-pull rail-to-rail output
signal
• 20-bit Digital Signal Processing
• Digital temperature compensation
• 12-bit overall resolution
• Operates from -40°C up to 120°C
• Low drift of output signal over temperature and lifetime
• Programmable parameters stored in redundant EEPROM (single bit error correction):
– magnetic range and magnetic sensitivity (gain)
– zero field voltage (offset)
– bandwidth
– polarity of the output slope
– clamping option
– temperature coefficient for all common magnets
– memory lock
• Re-programmable until memory lock
• Single supply voltage 4.5 - 5.5 V (4 - 7 V in extended range)
• Continuous measurement ranges between -200 mT and +200 mT
• Slim 3-pin package (Green)
• Reverse polarity and overvoltage protection for all pins
• Output short circuit protection
• On-board diagnostics (wire breakage detection, undervoltage, overvoltage)
• Digital readout of internal temperature and magnetic field values in calibration mode.
• Individual programming and operation of multiple sensors with common power supply
• Two-point calibration of magnetic transfer function
• Precise calibration without iteration steps
• High immunity against mechanical stress, EMC, ESD
Type
Marking
Ordering Code
Package
TLE4997I
4997I2
SP000248475
PG-SSO-3-10
Data Sheet
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TLE4997I
Overview
1.2
Target Applications
• Robust replacement of potentiometers
– No mechanical abrasion
– Resistant to humidity, temperature, pollution and vibration
• Linear and angular position sensing
• High current sensing
1.3
Pin Configuration
Figure 1 shows the location of the Hall element in the chip and the distance between the
Hall probe and the surface of the package.
0.38 ±0.05
2.03 ±0.1
1.625 ±0.1
Center of
Hall Probe
Branded Side
Hall-Probe
1
2
3
AEP03717
Figure 1
Pin Configuration and Hall Cell Location
Table 1
Pin Definitions and Functions
Pin No.
Symbol
Function
1
VDD
Supply voltage / programming interface
2
GND
Ground
3
OUT
Output voltage / programming interface
Data Sheet
8
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TLE4997I
General
2
General
2.1
Block Diagram
Figure 2 shows a simplified block diagram.
VDD
Interface
Supply
Bias
EEPROM
A
HALL
enable
D
D
VDD
DSP
Temp.
Sense
OUT
A
A
D
OBD
GND
ROM
Figure 2
2.2
Block Diagram
Functional Description
The linear Hall IC TLE4997I has been designed specifically to meet the demands of
highly accurate rotation and position detection, as well as for current measurement
applications.
The sensor provides a ratiometric analog output voltage, which is ideally suited to
Analog-to-Digital (A/D) conversion with the supply voltage as a reference.
The IC is produced in BiCMOS technology with high voltage capability and also provides
reverse polarity protection.
Digital signal processing using a 16-bit DSP architecture and digital temperature
compensation guarantees excellent stability over a long period of time.
The minimum overall resolution is 12 bits. Nevertheless, some internal stages work with
resolutions up to 20 bits.
Data Sheet
9
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TLE4997I
General
2.3
Principle of Operation
• A magnetic flux is measured by a Hall-Effect cell.
• The output signal from the Hall-Effect cell is converted from Analog to Digital signals.
• The chopped Hall-effect cell and continuous-time A to D conversion provide very low
and stable magnetic offset.
• A programmable Low-Pass filter reduces the noise.
• The temperature is measured and A to D converted.
• Temperature compensation is processed digitally using a second order function.
• Digital processing of output voltage is based on zero field and sensitivity value.
• The output voltage range can be clamped by digital limiters.
• The final output value is D to A converted.
• The output voltage is proportional to the supply voltage (ratiometric DAC).
• An On-Board-Diagnostics (OBD) circuit connects the output to VDD or GND in case of
errors.
Data Sheet
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TLE4997I
General
2.4
Transfer Functions
The examples in Figure 3 show how easily different magnetic field ranges can be
mapped to the output voltage.
• Polarity Mode:
– Unipolar: Only North- or South-oriented magnetic fields are measured.
– Bipolar:
Magnetic fields can be measured in both orientations.
The limit points must not be symmetric to the zero field point.
• Inversion: The gain values can be set positive or negative.
VOUT (V)
B (mT)
VOUT (V)
B (mT)
50
5
100
0
0
0
B (mT)
5 200
5
0
0
0
VOUT
-100
Example 1:
- Bipolar
Figure 3
-200
Example 2:
- Unipolar
- Big offset
- Output for 3.3 V
Example 3:
- Bipolar
- Inverted (neg. gain)
Examples of Operation
Note: Due to the ratiometry, voltage drops at the VDD line are imaged in the output
signal.
Data Sheet
11
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TLE4997I
Maximum Ratings
3
Maximum Ratings
Table 2
Absolute Maximum Ratings
Parameter
Symbol
Limit Values
min.
Unit
Notes
max.
TST
TJ
VDD
-40
150
°C
1)
-40
150
°C
1)
-16 2)
16 3)
V
RTHja ≤ 150 K/W
Supply current
@ overvoltage
IDDov
-
52
mA
Supply current
@ reverse voltage
IDDrev
- 75
-
mA
-16 4)
16 3)
V
Storage temperature
Junction temperature
Voltage on VDD pins with
respect to ground (VSS)
Voltage on output pin with VOUTov
respect to ground (VSS)
Magnetic field
BMAX
-
unlimited
T
ESD protection
VESD
-
2.0
kV
RTHja ≤ 150 K/W
Vout may be > VDD
According HBM
JESD22-A114-B 5)
1)
For limited time only. Depends on customer temperature lifetime cycles. Please ask for support by Infineon.
2)
max 24 h @ -40°C ≤ TJ < 30°C
max 10 min. @ 30°C ≤ TJ < 80°C
max 30 sec. @ 80°C ≤ TJ < 120°C
3)
max. 24 h @ TJ < 80°C.
4)
Max. 1 ms @ TJ < 30°C; -8.5 V for 100 h @ TJ < 80°C.
5)
100 pF and 1.5 kΩ
Note: Stresses above those listed under “Absolute Maximum Ratings” may cause
permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated in
the operational sections of this specification is not implied. Furthermore, only
single error cases are assumed. More than one stress/error case may also
damage the device.
Exposure to absolute maximum rating conditions for extended periods may affect
device reliability. During absolute maximum rating overload conditions (VIN > VDD
or VIN < VSS) the voltage on VDD pins with respect to ground (VSS) must not
exceed the values defined by the absolute maximum ratings.
Data Sheet
12
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TLE4997I
Operating Range
4
Operating Range
The following operating conditions must not be exceeded in order to ensure correct
operation of the TLE4997I. All parameters specified in the following sections of this
document refer to these operating conditions, unless otherwise indicated.
Table 3
Operating Range
Parameter
Supply voltage
Symbol Limit Values
VDD
Unit
min.
max.
4.5
5.5
V
4
7
V
Extended range 1)
Pull-down to GND
Pull-up to VDD
Load resistance
RL
10
50
-
kΩ
Load capacitance
CL
TJ
0
210
nF
-40
120
°C
Junction temperature 2)
1)
For reduced output accuracy.
2)
RTHja ≤ 150 K/W.
Notes
For 5000 h
Note: Keeping signal levels within the limits specified in this table ensures operation
without overload conditions
Data Sheet
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TLE4997I
Electrical and Magnetic Parameters
5
Electrical and Magnetic Parameters
Table 4
Electrical Characteristics
Parameter
Symbol Limit Values
Unit
Notes
min. typ. max.
VOUT
IDD
5
-
95
% VDD
3
7.5
10
mA
Also in extended VDD
range1), IOUT= 0mA
Output current @ OUT
shorted to supply lines
IOUTsh
-30
-
30
mA
For operating supply
voltage range only
Zero field voltage
VZERO -100
∆VZERO -0.5 -
100
%
Of VDD 2)
0.5
% VDD In lifetime 3)
0.5
% VDD Over temperature3)
Output voltage range
Supply current
Zero field voltage drift
-0.5
Ratiometry error
Thermal resistance
Power on time
ERAT
RthJA
RthJC
tPon
VDDpon
Output DAC quantization ∆VOUT
Power On Reset level
Output DAC resolution
-
Output DAC bandwidth
fDAC
Vnoise
Output noise
Differential non-linearity
Signal delay
DNL
tDS
-
-0.25 -
+0.25 %
Of VDD4)5)
-
-
219
K/W
Junction to air
-
-
47
K/W
Junction to case
-
-
1
10
ms
∆ VOUT ≤ ± 5% of VDD
∆ VOUT ≤ ± 1% of VDD
2
-
4
V
1.22
mV
12
bit
@ VDD = 5 V
3.2
-
kHz
Interpolation filter 6)
-
-
4.68
mVpp
5% exceeded 7)8)
-1
-
1
LSB
Of output DAC
-
-
250
µs
@ 100 Hz 9)
-
1)
For VOUT within the range of 5%... 95% of VDD
2)
Programmable in steps of 1.22 mV ( @ VDD = 5V ).
3)
For small sensitivity settings. For higher sensitivities, the magnetic offset drift is dominant.
This means that, for an example with a calibrated 60mV/mT sensitivity, the typical output drift
might be given due to the allowed magnetic offset tolerance up to ±0.5 mT x 60 mV/mT = ±30 mV @5 V V DD.
4)
For 4.5 V≤VDD≤5.5 V and within nominal VOUT range; see “Ratiometry” on Page 15 for details on ERAT.
5)
For the maximum error in the extended voltage range, see “Ratiometry” on Page 15.
6)
More information, see “DAC Input Interpolation Filter” on Page 22.
7)
100 mT range, sensitivity 60 mV/mT, LP-filter 244 Hz, 160 Hz external RC low pass filter as application circuit.
8)
’5% exceeded’ means that 5 of 100 continuously measured VOUT samples are out of limit.
9)
A sinusoidal magnetic field is applied, VOUT shows amplitude of 20% of VDD, no LP filter is selected.
Data Sheet
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TLE4997I
Electrical and Magnetic Parameters
Ratiometry
The linear Hall sensor works like a potentiometer. The output voltage is proportional to
the supply voltage. The division factor depends on the magnetic field strength. This
behavior is called “ratiometric”’.
The supply voltage VDD should be used as the reference for the A/D Converter of the
microcontroller. In this case, variations of VDD are compensated.
The ratiometry error is defined as follows:
 V OUT ( V DD ) V OUT ( 5V )
- – --------------------------- × 100 %
E RAT =  -----------------------------5V
V DD


The ratiometry error band displays as a “Butterfly Curve”.
%
n
ERAT
1
0.75
0.5
0.25
0
-0.25
-0.5
-0.75
-1
-n
4
5
6
7
VDD
Figure 4
V
Ratiometry Error Band
The error band in the extended VDD range below 4.5 V and above 5.5 V is defined as
shown in Figure 4. In the range from 6 to 7 Volts, the error band depends on the output
signal. For VOUT lower than 20% of VDD, the value for n is 2%. For VOUT higher than 80%
of VDD, the value for n is 5%. And if VOUT is kept (clamped) in between, the value for n
is 1%.
Note: Take care of possible voltage drops on the VDD and VOUT line degrading the
result. Ideally, both values are acquired and their ratio is calculated to gain the
highest accuracy. This method should be used especially during calibration.
Data Sheet
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TLE4997I
Electrical and Magnetic Parameters
Calculation of the Junction Temperature
The total power dissipation PTOT of the chip increases its temperature above the ambient
temperature.
The power multiplied with the total thermal resistance RthJA (Junction to Ambient) leads
to the final junction temperature. RthJA is the sum of the addition of the values of the two
components Junction to Case and Case to Ambient.
RthJA = RthJC + RthCA
TJ = TA + ∆T
∆T = RthJA x PTOT = RthJA x ( VDD x IDD + VOUT x IOUT )
IDD , IOUT > 0, if direction is into IC
Example (assuming no noticeable load on Vout):
– VDD = 5 V
– IDD = 10 mA
– ∆T = 219 [K/W] x (5 [V] x 0.01 [A] + 0 [VA]) = 11 K
For moulded sensors, the calculation with RthJC is more adequate.
Magnetic Parameters
Table 5
Magnetic Characteristics
Parameter
Symbol Limit Values
min.
typ.
Unit
Notes
mV/mT
1) 2)
max.
Sensitivity
S
± 12.5 -
Magnetic field range
MFR
± 50
± 1003) ± 200
mT
Programmable 4)
Integral nonlinearity
Inl
BOS
∆BOS
-15
-
15
mV
= ± 0.3% of VDD5)
-500
-
500
µT
6) 7) 8)
-5
-
5
µT / °C Error band 7)
Magnetic offset
Magnetic offset drift
± 300
1)
Programmable in steps of 0.024%.
2)
@ VDD = 5 V and TJ = 25°C
3)
This range is also used for temperature and offset pre-calibration of the IC.
4)
Depending on the Offset and Gain settings, the output may saturate at lower fields.
5)
Inl = Vout - Vout,lse with Vout,lse = least square error fit of Vout.
Valid in the range (5% of VDD) < VOUT < (95% of VDD)
6)
In operating temperature range. More information, see “Operating Range” on Page 13.
7)
For Sensitivity S > 25 mV / mT. For lower sensitivities, the zero field voltage drift is dominant.
8)
Measured at ± 100 mT range.
Data Sheet
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TLE4997I
Signal Processing
6
Signal Processing
The flow diagram in Figure 5 shows the data processing algorithm.
Range
LP
Limiter
Hall
Sensor
(Clamp)
A
D
X
D
+
A
out
LPDAC
Temperature
Sensor
Offset
TC 2
Gain
X
X
A
D
1
+
TC1
-T0
X
Temperature
Compensation
Figure 5
X
+
Stored in
EEPROM
Memory
Signal Processing Flow
Magnetic Field Path
• The analog output signal of the chopped Hall cell is converted in the continuous-time
A/D Converter. The range of the chopped A/D Converter can bet set in several steps
(see Table 6). This assures a suitable level for the A/D Converter.
• After the A/D conversion, a digital low pass filter reduces the bandwidth (Table 10).
• A multiplier amplifies the value according to the gain setting (see Table 8) plus
temperature compensation.
• The offset value is added (see Table 9).
• A limiter reduces the resulting signal to 12 bits and feeds the D/A converter.
Temperature Compensation
(Details are listed in Chapter 8)
• The output signal of the temperature cell is also A/D converted.
• The temperature is normalized by subtraction of the T0 value (zero point of the
quadratic function).
• The linear path is multiplied with the TC1 value.
Data Sheet
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TLE4997I
Signal Processing
• In the quadratic path, the difference temperature is squared and multiplied with the
TC2 value.
• Both path outputs are added together and multiplied with the gain value from the
EEPROM.
6.1
Magnetic Field Ranges
The working range of the magnetic field defines the input range of the A/D Converter. It
is always symmetric to the zero field point. Any two points in the magnetic range can be
selected to be the end points of the output curve. The output voltage represents the
range between the two points.
In the case of fields higher than the range values, the output signal may be distorted.
The range must be set before the calibration of offset and gain.
Table 6
Range Setting
Range
Range in mT
Parameter R
Low
± 50
3
Mid
± 100
1
High
± 200
0
Table 7
Parameter
Range
Symbol Limit Values
min.
Register size
1)
R
Unit
Notes
bit
1)
max.
2
Ranges do not have a guaranteed absolute accuracy. The temperature pre-calibration is performed in the mid
range (100 mT).
Data Sheet
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TLE4997I
Signal Processing
6.2
Gain Setting
The sensitivity is defined by the range and the gain setting. The output of the A/D
Converter is multiplied with the gain value.
Table 8
Gain
Parameter
Symbol Limit Values
min.
Register size
Gain range
Gain
Gain quantization steps ∆Gain
- 4.0
Notes
bit
Unsigned integer value
-
1)2)
ppm
Corresponds to 1/4096
max.
15
G
Unit
3.9998
244.14
1)
For gain values between - 0.5 and + 0.5, the numeric accuracy decreases.
To obtain a flatter output curve, it is recommended to select a higher range setting.
2)
A gain value of +1.0 corresponds to a typical 40 mV/mT sensitivity (100 mT range, not guaranteed). It is crucial
to do a final calibration of each IC within the application using the Gain/VOS value.
The gain value can be calculated by
:
( G – 16384 )
Gain = -----------------------------4096
6.3
Offset Setting
The offset voltage corresponds to an output voltage with zero field at the sensor.
Table 9
Offset
Parameter
Symbol Limit Values
min.
Register size
Offset range
Offset quantization
steps
1)
OS
VOS
∆VOS
Notes
bit
Unsigned integer value
% VDD
1)
mV
@ VDD = 5 V
generally VDD / 4095
max.
15
-400
Unit
399
1.22
It is crucial to do a final calibration of each IC within the application using the Gain/VOS value.
The offset value can be calculated by:
( OS – 16384 )
V OS = --------------------------------- × V DD
4096
Data Sheet
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TLE4997I
Signal Processing
6.4
DSP Input Low Pass Filter
A digital Low Pass Filter is placed between the Hall A/D Converter and the DSP to
reduce the noise level. The Low Pass filter has a constant DC amplification of 0 dB (this
is exactly a gain of 1), which means that its setting has no influence on the internal Hall
A/D Converter value.
The bandwidth can be set in 8 steps.
Table 10
Low Pass Filter Setting
Parameter LP
0
1
2
3
4
5
6
7
Cutoff Frequency in Hz
(at 3dB attenuation)1)
78
244
421
615
826
1060 1320 off2)
1)
As this is a digital filter running with an RC-based oscillator, the cutoff frequency may vary within ±30%.
2)
The output low pass-interpolation filter behavior remains as a main component in the signal path.
Table 11
Range
Parameter
Symbol Limit Values
min.
Register size
Corner frequency
variation
LP
∆f
- 30
Unit
Notes
max.
3
bit
+ 30
%
Note: In Range 7 (filter off), the output noise increases. Because of higher DSP load, the
current consumption also rises slightly.
Data Sheet
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TLE4997I
Signal Processing
Figure 6 shows the characteristic of the filter as a magnitude plot (the highest setting is
marked). The “off” position would be a flat 0 dB line. In this case, the output decimation
filter limits the bandwidth of the sensor. The update rate after the Low Pass filter is
16 kHz.
0
Magnitude (dB)
-1
-2
-3
-4
-5
-6
101
102
103
Frequency (Hz)
Figure 6
Data Sheet
DSP Input Filter (Magnitude Plot)
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TLE4997I
Signal Processing
6.5
DAC Input Interpolation Filter
An interpolation filter is placed between the DSP and the output DAC. It cannot be
switched off. This filter limits the frequency behavior of the complete system if the DSP
input filter is disabled. The update rate after the interpolation filter is 256 kHz.
0
Magnitude (dB)
-1
-2
-3
-4
-5
-6
101
102
103
104
Frequency (Hz)
Figure 7
DAC Input Filter (Magnitude Plot)
Note: As this is a digital filter running with an RC-based oscillator, the cutoff frequency
may vary within ±30%.
Data Sheet
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TLE4997I
Signal Processing
6.6
Clamping
The clamping function is useful for splitting the output voltage into the operating range
and error ranges. If the magnetic field is outside the selected measurement range, the
output voltage Vout is limited to the clamping values.
Table 12
Clamping
Parameter
Symbol Limit Values
min.
Register size
Clamping voltage low
Clamping voltage high
Clamping quantization
steps
Clamping voltage drift
CL,CH
VCLL
VCLH
∆VCLQ
∆VCL
Unit
Notes
max.
2 x 12
bit
0
100
% VDD
1)
0
100
% VDD
1)
mV
@ VDD = 5 V
% VDD
In lifetime2)
1.22
-0.5
0.5
-0.5
0.5
Over temperature2)
1)
If clamping is set, it must be within the allowed output voltage range to be effective.
2)
Valid in the range (5% of VDD) < VOUT < (95% of VDD)
The clamping values are calculated by:
Clamping low voltage:
CL
V CLL = ------------ × V DD
4096
Clamping high voltage:
CH
V CLH = ------------ × V DD
4096
Note: For an exact setup, the register value may be re-adjusted due to the actual output
voltage in the clamping condition. The output voltage range itself has electrical
limits. See the Electrical Characteristics of Vout.
Data Sheet
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TLE4997I
Signal Processing
Figure 8 shows an example in which the magnetic field range between Bmin and Bmax
is mapped to voltages between 0.8 V and 4.2 V.
5
V out (V)
Error range
V CLH
4
3
Operating range
2
1
VCLL
Error range
0
Bmin
Bmax
B (mT)
Figure 8
Clamping Example
Note: The high value must be above the low value.
Data Sheet
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TLE4997I
Error Detection
7
Error Detection
Different error cases can be detected by the On-Board-Diagnostics (OBD) and reported
to the microcontroller. The OBD is useful only when the clamping function is enabled. It
is important to set the clamping threshold values inside the error voltage values shown
in Table 13 and Table 14 to ensure that it is possible to distinguish between correct
output voltages and error signals.
7.1
Voltages Outside the Operating Range
The output signals error conditions, if VDD lies
• inside the ratings specified in Table 2 "Absolute Maximum Ratings" on Page 12
• outside the range specified in Table 3 "Operating Range" on Page 13.
Table 13
Undervoltage and Overvoltage
(RLOAD ≥ 10k pull down or 50k pull up)
Parameter
Symbol Limit Values
Output voltage
@ overvoltage
Supply current 1)
1)
Notes
min.
max.
3
4
V
VDDov
VOUTov
7
8.3
V
0.96 x VDD -
V
VDDov < VDD ≤ 16 V
IDDuv
-
mA
@ undervoltage
Undervoltage threshold VDDuv
Overvoltage threshold
Unit
10
For overvoltage and reverse voltage, see Table 2 "Absolute Maximum Ratings" on Page 12.
7.2
Open Circuit of Supply Lines
In the case of interrupted supply lines, the data acquisition device can alert the user.
Table 14
Open Circuit (OBD Parameters) 1)
Parameter
Symbol Limit Values
min.
max.
Unit
Output voltage
@ open VDD line
VOUT
0
0.2
V
Output voltage
@ open VSS line
VOUT
4.8
5
V
1)
Notes
With VDD = 5 V and RL ≥ 10 kΩ pull-down or RL ≥ 50 kΩ pull-up.
Data Sheet
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TLE4997I
Error Detection
7.3
Not Correctable EEPROM Errors
The parity method is able to correct one single bit in one EEPROM line. One other single
bit error in another line can also be detected. As this situation is not correctable, this
status is signalled at the output pin by clamping the output value to VDD.
Table 15
EEPROM Error Signalling
Parameter
Symbol
Limit Values
min.
Output voltage @
EEPROM error
Data Sheet
VOUT
Unit
Notes
max.
0.96 x VDD VDD
26
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TLE4997I
Temperature Compensation
8
Temperature Compensation
The magnetic field strength of a magnet depends on the temperature. This material
constant is specific to different magnet types. Therefore, the TLE4997I offers a second
order temperature compensation polynomial, by which the Hall signal output is multiplied
in the DSP.
There are three parameters for the compensation:
• Reference temperature T0
• A linear part (1st order) TC1
• A quadratic part (2nd order) TC2
The following formula describes the sensitivity dependent on the temperature in relation
to the sensitivity at the reference temperature T0:
S TC ( T ) = 1 + TC 1 × ( T – T 0 ) + TC 2 × ( T – T0 )
2
For more information, see also the signal processing flow in Figure 5.
The full temperature compensation of the complete system is done in three steps:
1. Pre-calibration in the Infineon final test.
The parameters TC1, TC2, T0 are set to maximally flat temperature characteristics
regarding the Hall probe and internal analog processing parts in the 100 mT range.
2. Overall System calibration.
The typical coefficients TC1, TC2, T0 of the magnetic circuitry are programmed. This
can be done deterministically, as the algorithm of the DSP is fully reproducible. The
final settings of the TC1, TC2, T0 values are relative to the pre-calibrated values.
Table 16
Temperature Compensation
Parameter
Register size TC1
1st order coefficient TC1
Quantization steps of TC1
Register size TC2
2nd order coefficient TC2
Quantization steps of TC2
Register size T0
Reference temperature
Quantization steps of T0
1)
Symbol Limit Values Unit
min.
max.
TL
TC1
∆TC1
-
9
TQ
TC2
∆TC2
-
8
bit
-4
4
ppm/ °C²
0.119
ppm/ °C²
TR
T0
∆T0
-
3
bit
- 48
64
°C
bit
Notes
Unsigned integer values
-1000 2500 ppm/ °C
15.26
16
ppm/ °C
°C
Unsigned integer values
Unsigned integer values
1)
A quantization step of 1°C is handled by algorithm (See Application Note).
Data Sheet
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TLE4997I
Temperature Compensation
8.1
Parameter Calculation
The parameters TC1, TC2 and T0 may be calculated by:
TL – 160
TC 1 = ---------------------- × 1000000
65536
TQ – 128
TC 2 = ----------------------- × 1000000
8388608
T 0 = 16TR – 48
Now the output VOUT for a given field BIN at a specific temperature can be roughly
calculated by:
 B IN

- × S TC × S TCHall × S o × V DD + V OS
V OUT =  ----------- B FSR

BFSR is the full range magnetic field. It is dependent on the range setting (e.g 100 mT).
So is the nominal sensitivity of the Hall probe times the Gain factor set in the EEPROM.
STC is the temperature-dependent sensitivity factor calculated by the DSP.
STCHall is the temperature behavior of the Hall probe.
The pre-calibration at Infineon is performed such that the following condition is met:
S TC ( T J – T 0 ) × S TCHall ( T J ) ≈ 1
Within the application, an additional factor BIN(T) / BIN(T0) will be given due to the
magnetic system. STC needs now to be modified to STCnew so that the following condition
is satisfied:
B IN ( T )
-------------------× S TCnew ( T ) × S TCHall ( T ) ≈ S TC ( T ) × S TCHall ( T ) ≈ 1
B IN ( T 0 )
Therefore, the new sensitivity parameters STCnew can be calculated from the
pre-calibrated setup STC using the relation:
B IN ( T )
-------------------× S TCnew ( T ) ≈ S TC ( T )
B IN ( T 0 )
Data Sheet
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TLE4997I
Calibration
9
Calibration
A special hardware interface to an external computing system and measurement
equipment is required for calibration of the sensor. All calibration and setup bits can be
written into a random access memory (RAM). This allows the EEPROM to remain
untouched during the entire calibration process. Therefore, this temporary setup (using
the RAM only) does not stress the EEPROM—and even allows a pre-verification1) of the
setup before programming—as the number of EEPROM programming cycles is limited
to provide a high data endurance.
The digital signal processing is completely deterministic. This allows a two point
calibration in one step without iterations. The two magnetic fields (here described as two
“positions” of an external magnetic circuitry) need to be applied only once. Furthermore,
a complete setup and calibration procedure can be performed requiring only one
EEPROM programming cycle at the end2).
After setting up the temperature coefficients, the calibrated Hall A/D Converter values of
both positions need to be read and the sensor output signals (using a DAC test mode)
need to be acquired for the corresponding end points. Using this data, the signal
processing parameters can be immediately calculated with a program running on the
external computing system.
Note: The calibration and programming process must be performed only at the
start of life of the device.
Table 17
Calibration Characteristics
Parameter
Symbol Limit Values
min.
max.
Unit
Notes
Temperature of sensor at
2 point calibration and
programming
tCAL
10
30
°C
2 point calibration
accuracy1)
∆VCAL1
-0.5
0.5
% of VDD In both positions
1)
Setup and validation performed at start of life.
Note: Depending on the application and external instrumentation setup, the accuracy of
the 2 point calibration can be improved.
1)
2)
This feature is not required for a deterministic two-point setup to fulfill the specification.
Details and basic algorithms for this step are available on request.
Data Sheet
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TLE4997I
Calibration
9.1
Calibration Data Memory
When the MEMLOCK bits are programmed (two redundant bits), the memory contents
are frozen and may no longer be changed. Furthermore, the programming interface is
locked out and the chip remains in Application Mode only. This prevents accidental
programming due to environmental influences.
RowA Parity Bits
Column Parity Bits
User-Calibration Bits
Pre-Calibration Bits
Figure 9
EEPROM Map
A matrix parity architecture allows the automatic correction of any single bit error. Each
row is protected by a row parity bit. The sum of bits set including this bit must be an odd
number (ODD PARITY). Each column is additionally protected by a column parity bit.
The sum of all the bits in the even positions (0, 2, etc.) of all lines must be an even
number (EVEN PARITY); the sum of all the bits in the odd positions (1,3, etc.) must be
an odd number (ODD PARITY). This mechanism of different parity calculations protects
against many block errors (such as erasing a full line or even the entire EEPROM).
When modifying the application bits (such as Gain, Offset, TC, etc.) the parity bits must
be updated. For the column bits, the pre-calibration area must be also read out and
considered for correct parity generation.
Note: A specific programming algorithm must be followed to ensure the data retention.
A separate detailed programming specification is available on request.
Data Sheet
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TLE4997I
Calibration
Table 18
Programming Characteristics
Parameter
Symbol Limit Values
Number of EEPROM
programming cycles
NPRG
Ambient temperature at TPRG
programming
min.
max.
-
8
Unit
Notes
Cycles
Programming allowed
only at start of lifetime
1)
10
30
°C
100
-
ms
For complete memory 2)
Programming time
tPRG
Calibration memory
-
135
Bit
All active EEPROM bits
Error correction
-
25
Bit
All parity EEPROM bits
1)
1 cycle is the simultaneous change of ≥ 1 bit. For experimental and evaluation purposes, the device may be
programmed more often, but then data retention is no longer guaranteed.
2)
Depends on the clock frequency at VDD.
9.2
Programming Interface
The supply pin and the output pin are used as two-wire interface to transmit the
EEPROM data to and from the sensor.
This allows
• communication with high data reliability
• bus-type connection of several sensors
In many applications, two sensors are used to measure the same parameter. This
redundancy allows the operation to continue in an emergency mode. If both sensors use
the same power supply lines, they can be programmed together in parallel.
The data transfer protocol and programming is described in a separate document. A
laboratory evaluation programmer for programming of the evaluation samples and
qualified samples is available on request.
Data Sheet
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TLE4997I
Application Circuit
10
Application Circuit
Figure 10 shows the connection of multiple sensors to a microcontroller.
Ref
Voltage Tracker
e.g.
TLE4250
ADCref
V DD
47nF
10k
TLE out
4997I
GND
ADCin1
47nF
100 nF
10k 100 nF
ADCin2
ADCGND
µC
optional
VDD
47nF
GND
Figure 10
10k
TLE out
4997I
47nF
100 nF
10k 100 nF
Application Circuit
Note: For calibration and programming, the interface must be connected directly to the
output pin.
The given application circuit must be regarded as only an example. It needs to be
adapted according to the requirements of the specific application.
Data Sheet
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TLE4997I
Package Outlines
11
Package Outlines
45˚
4.06 ±0.05
1.5
2 A
B
1.5 ±0.05
5˚
1)
1 ±0.2
(0.25)
5˚
R0.13 MAX.
4.05 ±0.05
0.1 MAX.
5˚
R0.1 MAX.
0.5 ±0.1
0.42 ±0.05
1
2
0.82 ±0.05
3x
0.36 ±0.05
0.5 B
3
2 x 1.27 = 2.54
1-1
6 ±0.5
18 ±0.5
19 ±0.5
33 MAX.
9 -0.50
+0.75
(10)
(Useable
Length)
12.7 ±1
A
Adhesive
Tape
Tape
4 ±0.3
6.35 ±0.4
12.7 ±0.3
Total tolerance at 19 pitches ±1
0.25 -0.15
0.39 ±0.1
GPO09662
1) No solder function area
Figure 11
Data Sheet
PG-SSO-3-10 (Plastic Green Single Small Outline Package)
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TLE4997I
Life Support Applications
12
Life Support Applications
This product is not designed for use in life support appliances, devices, or systems
where malfunction of these products can reasonably be expected to result in personal
injury. Infineon Technologies AG customers using or selling this product for use in such
applications do so at their own risk and agree to fully indemnify Infineon Technologies
AG for any damages resulting from such improper use or sale.
Data Sheet
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TLE4997I
Life Support Applications
Data Sheet
35
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w w w . i n f i n e o n . c o m
Published by Infineon Technologies AG