INFINEON IPD70P04P4-09

IPD70P04P4-09
OptiMOS®-P2 Power-Transistor
Product Summary
V DS
-40
V
R DS(on)
8.9
mΩ
ID
-73
A
Features
PG-TO252-3-313
• P-channel - Normal Level - Enhancement mode
• AEC qualified
• MSL1 up to 260°C peak reflow
• 175°C operating temperature
• Green package (RoHS compliant)
• 100% Avalanche tested
Type
Package
Marking
IPD70P04P4-09
PG-TO252-3-313
4P0409
Maximum ratings, at T j=25 °C, unless otherwise specified
Parameter
Symbol
Continuous drain current
ID
Conditions
T C=25°C,
V GS=-10V
T C=100°C,
V GS=-10V1)
Value
-73
Unit
A
-52
Pulsed drain current1)
I D,pulse
T C=25°C
-292
Avalanche energy, single pulse1)
E AS
I D=-36A
24
mJ
Avalanche current, single pulse
I AS
-
-73
A
Gate source voltage
V GS
-
±20
V
Power dissipation
P tot
T C=25 °C
75
W
Operating and storage temperature
T j, T stg
-
-55 ... +175
°C
IEC climatic category; DIN IEC 68-1
-
-
55/175/56
Rev. 1.0
page 1
2010-05-26
IPD70P04P4-09
Parameter
Symbol
Values
Conditions
Unit
min.
typ.
max.
Thermal characteristics1)
Thermal resistance, junction - case
R thJC
-
-
-
2
SMD version, device on PCB
R thJA
minimal footprint
-
-
62
6 cm2 cooling area2)
-
-
40
K/W
Electrical characteristics, at T j=25 °C, unless otherwise specified
Static characteristics
Drain-source breakdown voltage
V (BR)DSS V GS=0V, I D= -1mA
-40
-
-
Gate threshold voltage
-V GS(th) V DS=V GS, I D=-120µA
2.0
3.0
4.0
Zero gate voltage drain current
I DSS
-
-0.04
-1
-
-20
-200
V DS=-32V, V GS=0V,
T j=25°C
V DS=-32V, V GS=0V,
T j=125°C2)
V
µA
Gate-source leakage current
I GSS
V GS=-20V, V DS=0V
-
-
-100
nA
Drain-source on-state resistance
R DS(on)
V GS=-10V, I D=-70A
-
6.4
8.9
mΩ
Rev. 1.0
page 2
2010-05-26
IPD70P04P4-09
Parameter
Symbol
Values
Conditions
Unit
min.
typ.
max.
-
3700
4810
-
1400
1820
Dynamic characteristics1)
Input capacitance
C iss
V GS=0V, V DS=-25V,
f =1MHz
pF
Output capacitance
C oss
Reverse transfer capacitance
Crss
-
40
80
Turn-on delay time
t d(on)
-
19
-
Rise time
tr
-
12
-
Turn-off delay time
t d(off)
-
24
-
Fall time
tf
-
31
-
Gate to source charge
Q gs
-
20
26
Gate to drain charge
Q gd
-
10
20
Gate charge total
Qg
-
54
70
Gate plateau voltage
V plateau
-
-5.4
-
V
-
-
-73
A
-
-
-292
-
-1
-1.3
V
-
50
-
ns
-
50
-
nC
V DD=-20V,
V GS=-10V, I D=-73A,
R G=3.5Ω
ns
Gate Charge Characteristics 1)
V DD=-32V, I D=-70A,
V GS=0 to -10V
nC
Reverse Diode
Diode continous forward current 1)
IS
Diode pulse current 1)
I S,pulse
Diode forward voltage
V SD
Reverse recovery time 1)
t rr
Reverse recovery charge 1)
Q rr
1)
T C=25°C
V GS=0V, I F=-70A,
T j=25°C
V R=-20V, I F=-50A,
di F/dt =-100A/µs
Defined by design. Not subject to production test.
2)
Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain
connection. PCB is vertical in still air.
Rev. 1.0
page 3
2010-05-26
IPD70P04P4-09
2 Drain current
P tot = f(T C); V GS ≤ -6V
I D = f(T C); V GS = -10V
80
80
60
60
-I D [A]
P tot [W]
1 Power dissipation
40
20
40
20
0
0
0
50
100
150
200
0
50
100
T C [°C]
150
200
T C [°C]
3 Safe operating area
4 Max. transient thermal impedance
I D = f(V DS); T C = 25 °C; D = 0, SMD
Z thJC = f(t p)
parameter: t p
parameter: D =t p/T
1000
101
1 µs
100
10 µs
100
0.5
Z thJC [K/W]
100 µs
-I D [A]
1 ms
0.1
10-1
0.05
0.01
10
10-2
10-3
1
0.1
1
10
100
10-6
10-5
10-4
10-3
10-2
10-1
100
t p [s]
-V DS [V]
Rev. 1.0
single pulse
page 4
2010-05-26
IPD70P04P4-09
5 Typ. output characteristics
6 Typ. drain-source on-state resistance
I D = f(V DS); T j = 25 °C
R DS(on) = (I D); T j = 25 °C
parameter: -V GS
parameter: V GS
25
280
10V
5V
8V
20
7V
R DS(on) [mΩ]
-I D [A]
210
7V
6V
140
15
6V
8V
10
70
10V
5V
5
0
0
1
2
3
4
5
0
6
70
140
-V DS [V]
210
280
-I D [A]
7 Typ. transfer characteristics
8 Typ. drain-source on-state resistance
I D = f(V GS); V DS = -6V
R DS(on) = f(T j); I D = -70 A; V GS = -10 V
parameter: T j
280
11
10
210
R DS(on) [mΩ]
-I D [A]
9
140
8
7
6
70
175 °C
5
25 °C
-55 °C
4
0
2
3
4
5
6
7
8
Rev. 1.0
-60
-20
20
60
100
140
180
T j [°C]
-V GS [V]
page 5
2010-05-26
IPD70P04P4-09
9 Typ. gate threshold voltage
10 Typ. capacitances
V GS(th) = f(T j); V GS = V DS
C = f(V DS); V GS = 0 V; f = 1 MHz
parameter: -I D
105
4
3.5
104
Ciss
1200µA
120µA
C [pF]
-V GS(th) [V]
3
2.5
103
Coss
2
102
1.5
Crss
10
1
-60
-20
20
60
100
140
1
0
180
5
10
T j [°C]
15
20
25
30
140
180
-V DS [V]
11 Typical forward diode characteristicis
12 Drain-source breakdown voltage
I F = f(VSD)
V BR(DSS) = f(T j); I D = -1 mA
parameter: T j
45
103
44
43
42
-I F [A]
-V BR(DSS) [V]
102
25 °C
175 °C
10
41
40
39
1
38
37
36
100
35
0
0.4
0.8
1.2
1.6
-V SD [V]
Rev. 1.0
-60
-20
20
60
100
T j [°C]
page 6
2010-05-26
IPD70P04P4-09
13 Typ. gate charge
14 Gate charge waveforms
V GS = f(Q gate); I D = -73 A pulsed
parameter: V DD
12
V GS
-8V
10
Qg
-32V
-V GS [V]
8
6
4
Q gate
2
Q gs
Q gd
0
0
10
20
30
40
50
60
Q gate [nC]
Rev. 1.0
page 7
2010-05-26
IPD70P04P4-09
Published by
Infineon Technologies AG
81726 Munich, Germany
© Infineon Technologies AG 2010
All Rights Reserved.
Legal Disclaimer
The information given in this document shall in no event be regarded as a guarantee of conditions
or characteristics. With respect to any examples or hints given herein, any typical values stated
herein and/or any information regarding the application of the device, Infineon Technologies hereby
disclaims any and all warranties and liabilities of any kind, including without limitation, warranties
of non-infringement of intellectual property rights of any third party.
Information
For further information on technology, delivery terms and conditions and prices, please contact
the nearest Infineon Technologies Office (www.infineon.com).
Warnings
Due to technical requirements, components may contain dangerous substances.
For information on the types in question, please contact the nearest Infineon Technologies Office.
Infineon Technologies components may be used in life-support devices or systems only with the
express written approval of Infineon Technologies, if a failure of such components can reasonably be
expected to cause the failure of that life-support device or system or to affect the safety or
effectiveness of that device or system. Life support devices or systems are intended to be implanted
in the human body or to support and/or maintain and sustain and/or protect human life.
If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.0
page 8
2010-05-26
IPD70P04P4-09
Revision History
Date
Version
Changes
1.0
Rev. 1.0
21.05.2010 Final Data Sheet
page 9
2010-05-26