ELDRS Report_RH1011H_Fab Lot WP1075.1.pdf

Final Report
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Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1011H Voltage Comparator for Linear Technology
Customer: Linear Technology (PO49797L)
RAD Job Number: 08-131
Part Type Tested: Linear Technology RH1011H Voltage Comparator
Commercial Part Number: RH1011H
Traceability Information: Lot Date Code: 0703A, Fab Run # WP1075.1, W06 Can Assy Lot #417282.1
Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit.
External Traveler: None
Pre-Irradiation Burn-In: Burn-in performed by Linear Technology prior to receipt of parts by RAD, Inc.
TID Dose Rate and Maximum Total Dose: 10mrad(Si)/s to 50krad(Si) total ionizing dose
TID Test Increments: Pre-Irradiation, 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si)
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168-hour
100°C anneal. Both anneals were performed in the same electrical bias condition as the irradiations. Electrical
measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Programs: RH1011H.SRC
Hardware: LTS2020 Tester, 2101 Family Board, 0608 Fixture and DUT Board
TID Bias Conditions: Serial numbers 154-158 will be biased during irradiation, serial numbers 159, 160, 161, 163 and
174 will be unbiased during irradiation and serial number 162 will be used as the control.
Facility: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO
Radiation Source: Co60 (Gamma Beam 150)
Irradiation and Test Temperature: Ambient, room temperature
ELDRS Test Result: PASSED. All parts met datasheet specifications to
50krad(Si) with no substantial degradation to any measured parameter
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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3.0.
Radiation Assured Devices
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Radiation Test Conditions
The RH1011 voltage comparator described in this final report was tested using two bias conditions, biased
with a split 12V supply and all pins tied to ground, see Appendix A for details on biasing conditions.
These devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of
each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose
exposure within two hours from the end of the previous radiation increment. The ELDRS bias board
was positioned in the Co-60 cell to provide the required 10mrad(Si)/s and was located inside a leadaluminum box. The lead-aluminum box is required under MIL-STD-883G TM1019.7 Section 3.4 that
reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al
container to minimize dose enhancement effects caused by low-energy, scattered radiation. A minimum
of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container
produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation
field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed,
or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This
measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container
at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is
small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may
be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10.0mrad(Si)/s with a precision of ±5%.
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4.0.
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Tested Parameters
The following parameters were tested during the course of this work:
1. Positive Supply Current
2. Negative Supply Current
3. Input Offset Voltage
4. Input Offset Current
5. + Input Bias Current
6. - Input Bias Current
7. Large Signal Voltage Gain
8. Common Mode Rejection Ratio
9. Strobe Current
10. Output Sat Voltage @ 8mA
11. Output Sat Voltage @ 50mA
12. Output Leakage Current
Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement
resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are
contained in this report as well as in a separate Excel file. The attributes data contains the average, standard
deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814
using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of
confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent
defective (LTPD) approach. Note that the following criteria must be met for a device to pass the ELDRS
testing: following the radiation exposure the unit shall pass the specification value and the average value for
the each device must pass the specification value when the KTL limits are applied. If either of these
conditions is not satisfied following the radiation exposure, then the lot could be logged as an RLAT failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits
ELDRS” states the following: Select a minimum random sample of 21 devices from a population
representative of recent production runs. Smaller sample sizes may be used if agreed upon between the
parties to the test. All of the selected devices shall have undergone appropriate elevated temperature
reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5
each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts
assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5
under the irradiation bias given in the acquisition specification at 50-300 rad(Si)/s and room temperature.
Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition
specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels,
including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on
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each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10
where the low dose rate test is considered Condition D. Calculate the radiation induced change in each
electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara
at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level.
If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS
susceptible. This test does not apply to parameters which exhibit changes that are within experimental error
or whose values are below the pre-irradiation electrical specification limits at low dose rate at the
specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled “Radiation Lot
Acceptance Testing (RLAT) of the RH1011H Voltage Comparator for Linear Technology” to demonstrate
that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1011 devices passed the ELDRS test to 50krad(Si) with no
significant degradation to any measured parameter. It should be noted that the open loop gain (AVOL)
exceeded the specification post-irradiation (10 and 20krad(Si) read points) after application of the KTL
statistics. This is primarily due to our ability to measure this parameters with high precision (See
Appendix C, Table C.2). The testing and statistics used in this document are based on an “analysis of
variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MILHDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited
to this approach due to inherent large variations (e.g. AVOL, as discussed above) where the device
exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation. If
necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach.
If a lot tolerance percent defective (LTPD) approach were used, then 22-pieces could be tested and if all
units pass (without application of any statistics) then the lot is qualified to a 90/90 survival
probability/level of confidence, the same level as achieved using the KTL statistics discussed in this
report on a 5-piece sample size.
Figures 5.1 through 5.12 show plots of all the measured parameters versus total ionizing dose. In the
data plots the solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even
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after application of the KTL statistics (AVOL, as discussed above and input offset voltage where the
average values with the KTL statistics applied are outside of the specification due to the large standard
deviation of the sample population relative to the pre-irradiation VOS limit of 1.5mV.). The control
units, as expected, show no significant changes to any of the parameters. Therefore we can conclude
that the small observed degradation was due to the radiation exposure.
Tables 5.1 through 5.12 show the raw data, averages, standard deviation, +KTL statistics, -KTL
statistics, specification limit and Pass/Fail condition for each parameter.
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
4.50E-03
Positive Supply Current
4.00E-03
3.50E-03
3.00E-03
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.1. Plot of positive supply current versus total dose. The data shows no significant degradation with
dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average
of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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Table 5.1. Raw data for the positive supply current versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail)
Positive Supply Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
2.71E-03
2.78E-03
2.81E-03
2.87E-03
2.72E-03
2.80E-03
2.82E-03
2.75E-03
2.75E-03
2.75E-03
2.74E-03
24H
Anneal
70
2.73E-03
2.79E-03
2.80E-03
2.87E-03
2.74E-03
2.82E-03
2.82E-03
2.78E-03
2.75E-03
2.78E-03
2.78E-03
168H
Anneal
90
2.69E-03
2.80E-03
2.82E-03
2.88E-03
2.71E-03
2.78E-03
2.77E-03
2.78E-03
2.74E-03
2.78E-03
2.75E-03
2.78E-03
5.12E-05
2.92E-03
2.64E-03
2.78E-03
6.61E-05
2.96E-03
2.60E-03
2.79E-03
5.59E-05
2.94E-03
2.63E-03
2.78E-03
7.91E-05
3.00E-03
2.56E-03
2.77E-03
4.15E-05
2.89E-03
2.66E-03
4.00E-03
PASS
2.77E-03
3.36E-05
2.87E-03
2.68E-03
4.00E-03
PASS
2.79E-03
3.00E-05
2.87E-03
2.71E-03
4.00E-03
PASS
2.77E-03
1.73E-05
2.82E-03
2.72E-03
4.00E-03
PASS
0
2.75E-03
2.82E-03
2.82E-03
2.91E-03
2.78E-03
2.85E-03
2.87E-03
2.82E-03
2.74E-03
2.79E-03
2.79E-03
Total Dose (krad(Si))
10
20
30
2.73E-03 2.75E-03 2.72E-03
2.81E-03 2.79E-03 2.78E-03
2.83E-03 2.82E-03 2.79E-03
2.86E-03 2.89E-03 2.86E-03
2.77E-03 2.74E-03 2.76E-03
2.81E-03 2.80E-03 2.79E-03
2.82E-03 2.84E-03 2.83E-03
2.76E-03 2.78E-03 2.77E-03
2.70E-03 2.72E-03 2.72E-03
2.75E-03 2.76E-03 2.75E-03
2.76E-03 2.77E-03 2.75E-03
2.82E-03
6.02E-05
2.98E-03
2.65E-03
2.80E-03
5.10E-05
2.94E-03
2.66E-03
2.80E-03
6.06E-05
2.96E-03
2.63E-03
2.81E-03
5.13E-05
2.95E-03
2.67E-03
4.00E-03
PASS
2.77E-03
4.87E-05
2.90E-03
2.63E-03
4.00E-03
PASS
2.78E-03
4.47E-05
2.90E-03
2.66E-03
4.00E-03
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
3.00E-03
Negative Supply Current
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.2. Plot of negative supply current versus total dose. The data shows no significant degradation with
dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average
of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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Table 5.2. Raw data for the negative supply current versus total dose, including the statistical analysis, the
specification and the status of the testing (pass/fail)
Negative Supply Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
-1.87E-03
-1.91E-03
-1.93E-03
-1.98E-03
-1.87E-03
-1.94E-03
-1.93E-03
-1.89E-03
-1.89E-03
-1.90E-03
-1.90E-03
24H
Anneal
70
-1.89E-03
-1.92E-03
-1.93E-03
-1.97E-03
-1.88E-03
-1.93E-03
-1.93E-03
-1.91E-03
-1.89E-03
-1.92E-03
-1.92E-03
168H
Anneal
90
-1.86E-03
-1.93E-03
-1.94E-03
-1.98E-03
-1.86E-03
-1.92E-03
-1.90E-03
-1.91E-03
-1.88E-03
-1.92E-03
-1.91E-03
-1.92E-03
3.65E-05
-1.82E-03
-2.02E-03
-1.91E-03
4.60E-05
-1.79E-03
-2.04E-03
-1.92E-03
3.56E-05
-1.82E-03
-2.02E-03
-1.91E-03
5.27E-05
-1.77E-03
-2.06E-03
-1.91E-03
2.59E-05
-1.84E-03
-1.98E-03
2.50E-03
PASS
-1.91E-03
2.35E-05
-1.85E-03
-1.97E-03
2.50E-03
PASS
-1.92E-03
1.67E-05
-1.87E-03
-1.96E-03
2.50E-03
PASS
-1.91E-03
1.67E-05
-1.86E-03
-1.95E-03
2.50E-03
PASS
0
-1.90E-03
-1.94E-03
-1.95E-03
-2.01E-03
-1.91E-03
-1.96E-03
-1.98E-03
-1.94E-03
-1.89E-03
-1.93E-03
-1.93E-03
Total Dose (krad(Si))
10
20
30
-1.88E-03 -1.90E-03 -1.87E-03
-1.93E-03 -1.92E-03 -1.92E-03
-1.95E-03 -1.95E-03 -1.92E-03
-1.97E-03 -1.99E-03 -1.97E-03
-1.90E-03 -1.89E-03 -1.90E-03
-1.93E-03 -1.94E-03 -1.92E-03
-1.94E-03 -1.95E-03 -1.94E-03
-1.90E-03 -1.91E-03 -1.91E-03
-1.86E-03 -1.88E-03 -1.87E-03
-1.90E-03 -1.91E-03 -1.90E-03
-1.91E-03 -1.92E-03 -1.90E-03
-1.94E-03
4.32E-05
-1.82E-03
-2.06E-03
-1.93E-03
3.65E-05
-1.83E-03
-2.03E-03
-1.93E-03
4.06E-05
-1.82E-03
-2.04E-03
-1.94E-03
3.39E-05
-1.85E-03
-2.03E-03
2.50E-03
PASS
-1.91E-03
3.13E-05
-1.82E-03
-1.99E-03
2.50E-03
PASS
-1.92E-03
2.77E-05
-1.84E-03
-1.99E-03
2.50E-03
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX (V)
Specification MIN (V)
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
2.00E-03
1.50E-03
Input Offset Voltage
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
-3.00E-03
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.3. Plot of input offset voltage versus total dose. The data shows some degradation with dose for the
biased samples, however none of the units fall below specification. The average values with the KTL statistics
applied begin below specification due to the large standard deviation of the sample population relative to the preirradiation Vos limit of 1.5mV. The manufacturer notes that pre-irradiation VOS was aggressively specified at
1.5mV for marketing appeal. A more conservatively selected pre-irradiation limit of 3.0mV would have precluded
this KTL fail. The solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with
all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
12
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for the input offset voltage versus total dose, including the statistical analysis, the
specification and the status of the testing (pass/fail)
Input Offset Voltage
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN (V)
Status
Specification MAX (V)
Status
0
-8.80E-04
-3.70E-04
-1.50E-04
7.70E-04
-1.40E-04
-2.50E-04
2.30E-04
2.60E-04
-1.20E-04
-7.40E-04
-2.00E-04
Total Dose (krad(Si))
10
20
30
-1.18E-03 -1.31E-03 -1.38E-03
-6.50E-04 -7.90E-04 -8.60E-04
-4.60E-04 -5.90E-04 -6.40E-04
5.00E-04 3.50E-04 2.80E-04
-5.10E-04 -6.90E-04 -7.90E-04
-2.60E-04 -2.70E-04 -2.80E-04
2.30E-04 2.50E-04 2.50E-04
2.60E-04 2.80E-04 2.70E-04
-1.00E-04 -1.00E-04 -1.00E-04
-7.40E-04 -7.40E-04 -7.40E-04
-2.00E-04 -2.10E-04 -1.70E-04
50
-1.41E-03
-9.20E-04
-6.90E-04
1.80E-04
-9.70E-04
-2.70E-04
2.60E-04
2.80E-04
-1.00E-04
-7.50E-04
-1.70E-04
24H
Anneal
70
-1.38E-03
-8.90E-04
-6.80E-04
2.00E-04
-9.30E-04
-2.70E-04
2.60E-04
2.80E-04
-1.00E-04
-7.40E-04
-1.80E-04
-1.54E-04
5.97E-04
1.48E-03
-1.79E-03
-4.60E-04
6.08E-04
1.21E-03
-2.13E-03
-6.06E-04
6.02E-04
1.05E-03
-2.26E-03
-6.78E-04
6.04E-04
9.77E-04
-2.33E-03
-7.62E-04
5.88E-04
8.49E-04
-2.37E-03
-7.36E-04
5.82E-04
8.60E-04
-2.33E-03
-4.62E-04
6.06E-04
1.20E-03
-2.12E-03
-1.24E-04
4.09E-04
9.97E-04
-1.24E-03
-1.50E-03
FAIL
1.50E-03
PASS
-1.22E-04
4.10E-04
1.00E-03
-1.25E-03
-1.50E-03
FAIL
1.50E-03
PASS
-1.16E-04
4.20E-04
1.03E-03
-1.27E-03
-1.50E-03
FAIL
1.50E-03
PASS
-1.20E-04
4.18E-04
1.03E-03
-1.27E-03
-1.50E-03
FAIL
1.50E-03
PASS
-1.16E-04
4.25E-04
1.05E-03
-1.28E-03
-1.50E-03
FAIL
1.50E-03
PASS
-1.14E-04
4.22E-04
1.04E-03
-1.27E-03
-1.50E-03
FAIL
1.50E-03
PASS
-1.26E-04
4.10E-04
9.98E-04
-1.25E-03
-1.50E-03
FAIL
1.50E-03
PASS
An ISO 9001:2000 Certified Company
13
168H
Anneal
90
-1.19E-03
-6.90E-04
-4.70E-04
4.80E-04
-4.40E-04
-2.60E-04
2.10E-04
2.80E-04
-1.20E-04
-7.40E-04
-1.80E-04
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX (A)
Specification MIN (A)
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
5.00E-09
4.00E-09
Input Offset Current
3.00E-09
2.00E-09
1.00E-09
0.00E+00
-1.00E-09
-2.00E-09
-3.00E-09
-4.00E-09
-5.00E-09
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
Total Dose (krad(Si))
Figure 5.4. Plot of input offset current versus total dose. The data shows only a slight increase with dose for the
samples irradiated under bias. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines
(solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
14
168 hr
90
Avneal
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for input offset current versus total dose, including the statistical analysis, the
specification and the status of the testing (pass/fail).
Input Offset Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN (A)
Status
Specification MAX (A)
Status
50
1.13E-09
3.80E-10
7.00E-10
-2.90E-10
9.00E-10
5.00E-10
-1.00E-11
-3.60E-10
4.60E-10
1.00E-10
8.00E-11
24H
Anneal
70
1.35E-09
5.60E-10
8.10E-10
-2.10E-10
1.03E-09
4.30E-10
-2.00E-11
-5.00E-10
4.90E-10
1.40E-10
2.00E-11
168H
Anneal
90
4.80E-10
-2.40E-10
-7.00E-11
-6.20E-10
-2.40E-10
5.60E-10
1.00E-11
-4.80E-10
3.10E-10
1.80E-10
2.00E-11
2.22E-10
5.34E-10
1.69E-09
-1.24E-09
5.64E-10
5.51E-10
2.08E-09
-9.47E-10
7.08E-10
5.90E-10
2.32E-09
-9.09E-10
-1.38E-10
4.00E-10
9.59E-10
-1.23E-09
-4.00E-12
2.63E-10
7.16E-10
-7.24E-10
-4.00E-09
PASS
4.00E-09
PASS
1.38E-10
3.56E-10
1.11E-09
-8.37E-10
-4.00E-09
PASS
4.00E-09
PASS
1.08E-10
3.99E-10
1.20E-09
-9.86E-10
-4.00E-09
PASS
4.00E-09
PASS
1.16E-10
3.89E-10
1.18E-09
-9.51E-10
-4.00E-09
PASS
4.00E-09
PASS
0
5.90E-10
-4.00E-11
1.00E-10
-2.40E-10
1.60E-10
5.10E-10
2.00E-10
-4.50E-10
4.30E-10
2.10E-10
-1.80E-10
Total Dose (krad(Si))
10
20
30
6.20E-10 6.50E-10 9.00E-10
1.10E-10 2.60E-10 3.40E-10
6.00E-11 4.60E-10 1.70E-10
-1.50E-10 -4.80E-10 -5.90E-10
1.30E-10 5.90E-10 2.90E-10
4.90E-10 4.40E-10 1.20E-10
1.60E-10 -6.00E-11 -1.00E-10
-4.80E-10 -4.10E-10 -4.20E-10
3.30E-10 3.80E-10 2.30E-10
0.00E+00 1.30E-10 1.50E-10
-1.70E-10 -2.20E-10 5.00E-11
1.14E-10
3.07E-10
9.57E-10
-7.29E-10
1.54E-10
2.83E-10
9.31E-10
-6.23E-10
2.96E-10
4.59E-10
1.55E-09
-9.62E-10
1.80E-10
3.77E-10
1.21E-09
-8.55E-10
-4.00E-09
PASS
4.00E-09
PASS
1.00E-10
3.72E-10
1.12E-09
-9.21E-10
-4.00E-09
PASS
4.00E-09
PASS
9.60E-11
3.47E-10
1.05E-09
-8.54E-10
-4.00E-09
PASS
4.00E-09
PASS
An ISO 9001:2000 Certified Company
15
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Specification MIN
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
2.00E-07
1.50E-07
+ Input Bias Current
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
-2.00E-07
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
Total Dose (krad(Si))
Figure 5.5. Plot of input bias current (non-inverting input) versus total dose. The data shows no significant
degradation with dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
16
168 hr
90
Avneal
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for input bias current (non-inverting input) versus total dose, including the statistical
analysis, the specification and the status of the testing (pass/fail).
+ Input Bias Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-3.38E-08
-3.29E-08
-3.48E-08
-3.23E-08
-3.46E-08
-2.84E-08
-2.86E-08
-2.91E-08
-2.98E-08
-3.10E-08
-2.28E-08
24H
Anneal
70
-3.41E-08
-3.32E-08
-3.44E-08
-3.26E-08
-3.48E-08
-2.84E-08
-2.87E-08
-2.94E-08
-2.97E-08
-3.09E-08
-2.29E-08
168H
Anneal
90
-3.37E-08
-3.24E-08
-3.38E-08
-3.10E-08
-3.51E-08
-2.77E-08
-2.69E-08
-2.88E-08
-2.84E-08
-3.05E-08
-2.31E-08
-2.83E-08
6.48E-10
-2.65E-08
-3.00E-08
-3.37E-08
1.07E-09
-3.08E-08
-3.66E-08
-3.38E-08
9.20E-10
-3.13E-08
-3.63E-08
-3.32E-08
1.54E-09
-2.90E-08
-3.74E-08
-2.60E-08
9.60E-10
-2.34E-08
-2.87E-08
-1.00E-07
PASS
1.00E-07
PASS
-2.93E-08
1.05E-09
-2.65E-08
-3.22E-08
-1.50E-07
PASS
1.50E-07
PASS
-2.94E-08
9.90E-10
-2.67E-08
-3.21E-08
-1.50E-07
PASS
1.50E-07
PASS
-2.85E-08
1.36E-09
-2.47E-08
-3.22E-08
-1.50E-07
PASS
1.50E-07
PASS
0
-2.16E-08
-2.15E-08
-2.18E-08
-2.10E-08
-2.18E-08
-2.14E-08
-2.13E-08
-2.18E-08
-2.19E-08
-2.36E-08
-2.27E-08
Total Dose (krad(Si))
10
20
30
-2.37E-08 -2.62E-08 -2.84E-08
-2.31E-08 -2.51E-08 -2.75E-08
-2.34E-08 -2.67E-08 -2.91E-08
-2.32E-08 -2.56E-08 -2.77E-08
-2.31E-08 -2.60E-08 -2.86E-08
-2.22E-08 -2.41E-08 -2.48E-08
-2.19E-08 -2.39E-08 -2.58E-08
-2.24E-08 -2.43E-08 -2.61E-08
-2.29E-08 -2.50E-08 -2.59E-08
-2.38E-08 -2.57E-08 -2.75E-08
-2.30E-08 -2.28E-08 -2.29E-08
-2.15E-08
3.54E-10
-2.06E-08
-2.25E-08
-2.33E-08
2.63E-10
-2.26E-08
-2.40E-08
-2.59E-08
6.06E-10
-2.42E-08
-2.76E-08
-2.20E-08
9.15E-10
-1.95E-08
-2.45E-08
-5.00E-08
PASS
5.00E-08
PASS
-2.26E-08
7.48E-10
-2.06E-08
-2.47E-08
-5.00E-08
PASS
5.00E-08
PASS
-2.46E-08
7.62E-10
-2.25E-08
-2.67E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
17
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
2.00E-07
1.50E-07
- Input Bias Current
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
-2.00E-07
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.6. Plot of input bias current (inverting input) versus total dose. The data shows no significant
degradation with dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
18
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for input bias current (inverting input) versus total dose, including the statistical analysis, the
specification and the status of the testing (pass/fail).
- Input Bias Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
50
-3.23E-08
-3.24E-08
-3.45E-08
-3.31E-08
-3.36E-08
-2.85E-08
-2.93E-08
-2.92E-08
-2.93E-08
-3.07E-08
-2.24E-08
24H
Anneal
70
-3.27E-08
-3.22E-08
-3.44E-08
-3.30E-08
-3.40E-08
-2.85E-08
-2.86E-08
-2.93E-08
-2.93E-08
-3.06E-08
-2.25E-08
168H
Anneal
90
-3.37E-08
-3.29E-08
-3.41E-08
-3.14E-08
-3.48E-08
-2.66E-08
-2.73E-08
-2.90E-08
-2.87E-08
-3.03E-08
-2.25E-08
-2.84E-08
7.60E-10
-2.64E-08
-3.05E-08
-3.32E-08
8.88E-10
-3.07E-08
-3.56E-08
-3.32E-08
9.41E-10
-3.07E-08
-3.58E-08
-3.34E-08
1.30E-09
-2.98E-08
-3.69E-08
-2.62E-08
8.84E-10
-2.38E-08
-2.87E-08
-1.00E-07
PASS
1.00E-07
PASS
-2.94E-08
7.96E-10
-2.72E-08
-3.16E-08
-1.50E-07
PASS
1.50E-07
PASS
-2.93E-08
8.46E-10
-2.70E-08
-3.16E-08
-1.50E-07
PASS
1.50E-07
PASS
-2.84E-08
1.48E-09
-2.43E-08
-3.24E-08
-1.50E-07
PASS
1.50E-07
PASS
0
-2.08E-08
-2.12E-08
-2.18E-08
-2.13E-08
-2.17E-08
-2.06E-08
-2.09E-08
-2.20E-08
-2.15E-08
-2.34E-08
-2.27E-08
Total Dose (krad(Si))
10
20
30
-2.31E-08 -2.55E-08 -2.81E-08
-2.25E-08 -2.53E-08 -2.75E-08
-2.35E-08 -2.65E-08 -2.93E-08
-2.36E-08 -2.63E-08 -2.91E-08
-2.33E-08 -2.58E-08 -2.82E-08
-2.29E-08 -2.45E-08 -2.57E-08
-2.23E-08 -2.36E-08 -2.58E-08
-2.32E-08 -2.55E-08 -2.64E-08
-2.28E-08 -2.43E-08 -2.57E-08
-2.49E-08 -2.56E-08 -2.77E-08
-2.26E-08 -2.25E-08 -2.24E-08
-2.14E-08
4.28E-10
-2.02E-08
-2.25E-08
-2.32E-08
4.45E-10
-2.20E-08
-2.44E-08
-2.59E-08
4.94E-10
-2.45E-08
-2.72E-08
-2.17E-08
1.09E-09
-1.87E-08
-2.47E-08
-5.00E-08
PASS
5.00E-08
PASS
-2.32E-08
9.82E-10
-2.05E-08
-2.59E-08
-5.00E-08
PASS
5.00E-08
PASS
-2.47E-08
8.47E-10
-2.24E-08
-2.70E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
19
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
1.50E+03
Large Signal Voltage Gain
1.00E+03
5.00E+02
0.00E+00
-5.00E+02
-1.00E+03
-1.50E+03
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.7. Plot of large signal voltage gain (AVOL) versus total dose. The data shows some degradation with total
dose, however not sufficient for any of the units under test to fall below specification. With regards to the KTL
values being “out of specification” Refer to the measurement resolution of Large Signal Voltage Gain Measurement
in Appendix C, Table C.2, which shows that the measurement uncertainty of this parameter is significantly larger
than the datasheet minimum of 200V/mV. Note that the standard deviation of the population actually improves with
radiation due to the slight decrease in AVOL and a concomitant improvement in the measurement precision. The
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground.
The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the
sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
20
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data of large signal voltage gain (AVOL) versus total dose, including the statistical analysis, the
specification and the status of the testing (pass/fail).
Large Signal Voltage Gain
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.25E+03
1.15E+03
6.93E+02
1.10E+03
6.76E+02
6.35E+02
1.15E+03
7.42E+02
7.55E+02
6.75E+02
1.55E+03
Total Dose (krad(Si))
10
20
30
1.05E+03 6.92E+02 7.97E+02
9.07E+02 6.42E+02 7.11E+02
1.37E+03 9.40E+02 1.32E+03
7.53E+02 1.22E+03 1.15E+03
8.22E+02 1.20E+03 8.22E+02
1.33E+03 5.45E+02 7.05E+02
1.22E+03 6.26E+02 6.82E+02
5.91E+02 1.08E+03 7.99E+02
7.57E+02 4.73E+02 7.08E+02
2.63E+03 1.64E+03 8.49E+02
1.12E+03 9.64E+02 1.06E+03
9.73E+02
2.70E+02
1.71E+03
2.34E+02
9.82E+02
2.46E+02
1.66E+03
3.07E+02
9.37E+02
2.70E+02
1.68E+03
1.97E+02
9.59E+02
2.59E+02
1.67E+03
2.47E+02
7.91E+02 1.30E+03 8.73E+02 7.48E+02
2.06E+02 8.03E+02 4.91E+02 7.16E+01
1.36E+03 3.51E+03 2.22E+03 9.45E+02
2.27E+02 -8.96E+02 -4.74E+02 5.52E+02
2.00E+02 2.00E+02 2.00E+02 2.00E+02
PASS
FAIL
FAIL
PASS
An ISO 9001:2000 Certified Company
21
50
7.52E+02
6.92E+02
6.74E+02
8.64E+02
8.49E+02
1.02E+03
7.42E+02
6.87E+02
5.26E+02
6.12E+02
7.49E+02
24H
Anneal
70
8.22E+02
6.26E+02
6.74E+02
6.12E+02
8.22E+02
1.01E+03
7.23E+02
1.05E+03
7.13E+02
6.26E+02
1.35E+03
168H
Anneal
90
6.42E+02
8.77E+02
8.52E+02
6.99E+02
6.50E+02
6.76E+02
5.95E+02
6.50E+02
7.05E+02
5.48E+02
9.64E+02
7.66E+02
8.73E+01
1.01E+03
5.27E+02
7.11E+02
1.04E+02
9.95E+02
4.27E+02
7.44E+02
1.13E+02
1.05E+03
4.35E+02
7.18E+02 8.24E+02 6.35E+02
1.89E+02 1.91E+02 6.32E+01
1.24E+03 1.35E+03 8.08E+02
2.00E+02 2.99E+02 4.61E+02
1.50E+02 1.50E+02 1.50E+02
PASS
PASS
PASS
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Common Mode Rejection Ratio
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.8. Plot of common mode rejection ratio (CMRR) versus total dose. The data shows some degradation
with total dose, however not sufficient for any of the units under test to fall below specification. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground.
The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the
sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
22
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for the common mode rejection ratio (CMRR) versus total dose, including the statistical
analysis, the specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.05E+02
1.07E+02
1.08E+02
1.09E+02
1.02E+02
1.13E+02
1.12E+02
1.15E+02
1.22E+02
1.23E+02
1.19E+02
24H
Anneal
70
1.05E+02
1.06E+02
1.08E+02
1.11E+02
1.02E+02
1.12E+02
1.13E+02
1.15E+02
1.24E+02
1.22E+02
1.29E+02
168H
Anneal
90
1.14E+02
1.14E+02
1.20E+02
1.31E+02
1.12E+02
1.10E+02
1.12E+02
1.16E+02
1.22E+02
1.18E+02
1.28E+02
1.09E+02
3.49E+00
1.18E+02
9.91E+01
1.06E+02
2.85E+00
1.14E+02
9.82E+01
1.07E+02
3.43E+00
1.16E+02
9.72E+01
1.18E+02
8.03E+00
1.40E+02
9.60E+01
1.16E+02
3.93E+00
1.27E+02
1.05E+02
9.00E+01
PASS
1.17E+02
5.14E+00
1.31E+02
1.03E+02
9.00E+01
PASS
1.17E+02
5.67E+00
1.33E+02
1.01E+02
9.00E+01
PASS
1.15E+02
4.72E+00
1.28E+02
1.03E+02
9.00E+01
PASS
0
1.19E+02
1.22E+02
1.39E+02
1.31E+02
1.18E+02
1.12E+02
1.13E+02
1.15E+02
1.37E+02
1.21E+02
1.51E+02
Total Dose (krad(Si))
10
20
30
1.10E+02 1.08E+02 1.06E+02
1.12E+02 1.09E+02 1.08E+02
1.15E+02 1.13E+02 1.12E+02
1.21E+02 1.18E+02 1.13E+02
1.08E+02 1.06E+02 1.05E+02
1.09E+02 1.11E+02 1.11E+02
1.11E+02 1.12E+02 1.13E+02
1.16E+02 1.18E+02 1.17E+02
1.21E+02 1.25E+02 1.21E+02
1.19E+02 1.20E+02 1.18E+02
1.28E+02 1.25E+02 1.19E+02
1.26E+02
8.96E+00
1.50E+02
1.01E+02
1.13E+02
5.17E+00
1.27E+02
9.89E+01
1.11E+02
4.66E+00
1.23E+02
9.78E+01
1.19E+02
1.03E+01
1.48E+02
9.11E+01
9.00E+01
PASS
1.15E+02
5.02E+00
1.29E+02
1.01E+02
9.00E+01
PASS
1.17E+02
5.91E+00
1.33E+02
1.01E+02
9.00E+01
PASS
An ISO 9001:2000 Certified Company
23
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
0.00E+00
Strobe Current
-1.00E-04
-2.00E-04
-3.00E-04
-4.00E-04
-5.00E-04
-6.00E-04
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.9. Plot of strobe current versus total dose. The data shows no significant degradation with dose. The
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics
on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
24
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for strobe current versus total dose, including the statistical analysis, the specification and the
status of the testing (pass/fail).
Strobe Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
50
-1.56E-04
-1.56E-04
-1.74E-04
-1.88E-04
-1.56E-04
-1.91E-04
-1.56E-04
-2.35E-04
-2.11E-04
-1.66E-04
-1.92E-04
24H
Anneal
70
-1.56E-04
-1.56E-04
-1.56E-04
-1.73E-04
-1.70E-04
-1.56E-04
-1.56E-04
-1.97E-04
-1.56E-04
-1.96E-04
-1.56E-04
168H
Anneal
90
-1.77E-04
-1.75E-04
-1.77E-04
-2.06E-04
-1.56E-04
-1.65E-04
-1.74E-04
-2.05E-04
-1.57E-04
-1.78E-04
-2.12E-04
-1.85E-04
3.26E-05
-9.54E-05
-2.74E-04
-1.66E-04
1.46E-05
-1.26E-04
-2.06E-04
-1.62E-04
8.52E-06
-1.39E-04
-1.86E-04
-1.78E-04
1.77E-05
-1.29E-04
-2.27E-04
-1.63E-04
9.37E-06
-1.38E-04
-1.89E-04
-5.00E-04
PASS
-1.92E-04
3.21E-05
-1.04E-04
-2.80E-04
-5.00E-04
PASS
-1.72E-04
2.19E-05
-1.12E-04
-2.32E-04
-5.00E-04
PASS
-1.76E-04
1.84E-05
-1.25E-04
-2.26E-04
-5.00E-04
PASS
0
-1.56E-04
-1.56E-04
-1.90E-04
-2.13E-04
-2.35E-04
-1.75E-04
-1.56E-04
-2.20E-04
-1.56E-04
-1.63E-04
-1.56E-04
Total Dose (krad(Si))
10
20
30
-1.62E-04 -1.65E-04 -1.56E-04
-2.35E-04 -2.18E-04 -1.81E-04
-1.56E-04 -1.56E-04 -1.56E-04
-1.56E-04 -1.56E-04 -1.96E-04
-1.99E-04 -2.35E-04 -2.35E-04
-1.56E-04 -1.64E-04 -1.56E-04
-1.56E-04 -2.35E-04 -1.58E-04
-1.56E-04 -2.35E-04 -1.56E-04
-1.56E-04 -1.76E-04 -1.76E-04
-1.84E-04 -1.64E-04 -1.71E-04
-1.91E-04 -1.56E-04 -1.81E-04
-1.90E-04
3.47E-05
-9.48E-05
-2.85E-04
-1.81E-04
3.45E-05
-8.67E-05
-2.76E-04
-1.86E-04
3.73E-05
-8.35E-05
-2.88E-04
-1.74E-04
2.70E-05
-1.00E-04
-2.48E-04
-5.00E-04
PASS
-1.62E-04
1.23E-05
-1.28E-04
-1.95E-04
-5.00E-04
PASS
-1.95E-04
3.66E-05
-9.43E-05
-2.95E-04
-5.00E-04
PASS
An ISO 9001:2000 Certified Company
25
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
4.50E-01
Output Sat Voltage @ 8mA
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.10. Plot of output saturation voltage (8mA load) versus total dose. The data show no significant
degradation with dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
26
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for output saturation voltage (8mA load) versus total dose, including the statistical analysis,
the specification and the status of the testing (pass/fail).
Output Sat Voltage @ 8mA
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
2.13E-01
2.24E-01
2.19E-01
2.20E-01
2.19E-01
2.20E-01
2.25E-01
2.21E-01
2.16E-01
2.09E-01
2.06E-01
24H
Anneal
70
2.14E-01
2.24E-01
2.18E-01
2.19E-01
2.19E-01
2.20E-01
2.24E-01
2.20E-01
2.17E-01
2.10E-01
2.06E-01
168H
Anneal
90
2.14E-01
2.24E-01
2.18E-01
2.19E-01
2.18E-01
2.21E-01
2.25E-01
2.19E-01
2.17E-01
2.09E-01
2.06E-01
2.16E-01
4.04E-03
2.27E-01
2.05E-01
2.19E-01
3.94E-03
2.30E-01
2.08E-01
2.19E-01
3.56E-03
2.29E-01
2.09E-01
2.19E-01
3.58E-03
2.28E-01
2.09E-01
2.16E-01
5.07E-03
2.30E-01
2.02E-01
4.00E-01
PASS
2.18E-01
6.06E-03
2.35E-01
2.02E-01
4.00E-01
PASS
2.18E-01
5.22E-03
2.33E-01
2.04E-01
4.00E-01
PASS
2.18E-01
5.93E-03
2.34E-01
2.02E-01
4.00E-01
PASS
0
2.08E-01
2.18E-01
2.13E-01
2.13E-01
2.09E-01
2.14E-01
2.16E-01
2.13E-01
2.12E-01
2.05E-01
2.06E-01
Total Dose (krad(Si))
10
20
30
2.09E-01 2.11E-01 2.11E-01
2.19E-01 2.22E-01 2.22E-01
2.13E-01 2.14E-01 2.16E-01
2.15E-01 2.15E-01 2.18E-01
2.10E-01 2.12E-01 2.15E-01
2.15E-01 2.17E-01 2.18E-01
2.18E-01 2.21E-01 2.21E-01
2.16E-01 2.17E-01 2.19E-01
2.14E-01 2.14E-01 2.15E-01
2.06E-01 2.06E-01 2.08E-01
2.07E-01 2.06E-01 2.07E-01
2.12E-01
3.96E-03
2.23E-01
2.01E-01
2.13E-01
4.02E-03
2.24E-01
2.02E-01
2.15E-01
4.32E-03
2.27E-01
2.03E-01
2.12E-01
4.18E-03
2.23E-01
2.01E-01
4.00E-01
PASS
2.14E-01
4.60E-03
2.26E-01
2.01E-01
4.00E-01
PASS
2.15E-01
5.61E-03
2.30E-01
2.00E-01
4.00E-01
PASS
An ISO 9001:2000 Certified Company
27
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
1.60E+00
Output Sat Voltage @ 50mA
1.40E+00
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.11. Plot of output saturation voltage (50mA load) versus total dose. The data show no significant
degradation with dose. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the
unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
28
Final Report
R1.3 080916
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for output saturation voltage (50mA load) versus total dose, including the statistical
analysis, the specification and the status of the testing (pass/fail).
Output Sat Voltage @ 50mA
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
6.24E-01
6.49E-01
6.30E-01
6.23E-01
6.12E-01
6.22E-01
6.24E-01
6.30E-01
6.29E-01
6.18E-01
6.21E-01
Total Dose (krad(Si))
10
20
30
6.28E-01 6.29E-01 6.34E-01
6.51E-01 6.58E-01 6.61E-01
6.32E-01 6.36E-01 6.44E-01
6.33E-01 6.32E-01 6.37E-01
6.20E-01 6.25E-01 6.27E-01
6.30E-01 6.31E-01 6.36E-01
6.34E-01 6.33E-01 6.40E-01
6.39E-01 6.40E-01 6.41E-01
6.37E-01 6.37E-01 6.39E-01
6.24E-01 6.26E-01 6.30E-01
6.26E-01 6.22E-01 6.28E-01
50
6.36E-01
6.63E-01
6.42E-01
6.38E-01
6.37E-01
6.37E-01
6.44E-01
6.46E-01
6.41E-01
6.31E-01
6.28E-01
24H
Anneal
70
6.35E-01
6.63E-01
6.42E-01
6.40E-01
6.35E-01
6.36E-01
6.44E-01
6.43E-01
6.36E-01
6.29E-01
6.24E-01
6.28E-01
1.36E-02
6.65E-01
5.90E-01
6.33E-01
1.14E-02
6.64E-01
6.02E-01
6.36E-01
1.29E-02
6.71E-01
6.01E-01
6.41E-01
1.29E-02
6.76E-01
6.05E-01
6.43E-01
1.13E-02
6.74E-01
6.12E-01
6.43E-01
1.16E-02
6.75E-01
6.11E-01
6.43E-01
1.06E-02
6.72E-01
6.14E-01
6.25E-01
4.98E-03
6.38E-01
6.11E-01
1.50E+00
PASS
6.33E-01
5.97E-03
6.49E-01
6.16E-01
1.50E+00
PASS
6.33E-01
5.41E-03
6.48E-01
6.19E-01
1.50E+00
PASS
6.37E-01
4.44E-03
6.49E-01
6.25E-01
1.50E+00
PASS
6.40E-01
5.97E-03
6.56E-01
6.23E-01
1.50E+00
PASS
6.38E-01
6.11E-03
6.54E-01
6.21E-01
1.50E+00
PASS
6.39E-01
7.38E-03
6.59E-01
6.19E-01
1.50E+00
PASS
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168H
Anneal
90
6.40E-01
6.61E-01
6.40E-01
6.38E-01
6.34E-01
6.40E-01
6.47E-01
6.42E-01
6.39E-01
6.27E-01
6.28E-01
Final Report
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(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
1.00E-05
Output Leakage Current
1.00E-06
1.00E-07
1.00E-08
1.00E-09
1.00E-10
1.00E-11
0
10
20
30
40
50
60
.
24 hr
70
Anneal
80
168 hr
90
Avneal
Total Dose (krad(Si))
Figure 5.12. Plot of output leakage current versus total dose. The data show no significant degradation with
dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average
of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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(719) 531-0800
Table 5.12. Raw data for output leakage current versus total dose, including the statistical analysis, the
specification and the status of the testing (pass/fail).
Output Leakage Current
Device
154
155
156
157
158
159
160
161
174
163
162
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
4.00E-10
1.00E-10
2.00E-10
1.00E-10
5.00E-10
0.00E+00
0.00E+00
1.00E-10
0.00E+00
2.00E-10
2.00E-10
24H
Anneal
70
4.00E-10
1.00E-10
3.00E-10
2.00E-10
5.00E-10
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.60E-09
2.00E-10
168H
Anneal
90
3.00E-10
1.00E-10
0.00E+00
0.00E+00
2.00E-10
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.00E-10
0.00E+00
4.00E-11
5.48E-11
1.90E-10
-1.10E-10
2.60E-10
1.82E-10
7.58E-10
-2.38E-10
3.00E-10
1.58E-10
7.34E-10
-1.34E-10
1.20E-10
1.30E-10
4.78E-10
-2.38E-10
1.80E-10
1.10E-10
4.80E-10
-1.20E-10
1.00E-08
PASS
6.00E-11
8.94E-11
3.05E-10
-1.85E-10
1.00E-07
PASS
3.20E-10
7.16E-10
2.28E-09
-1.64E-09
1.00E-07
PASS
2.00E-11
4.47E-11
1.43E-10
-1.03E-10
1.00E-07
PASS
0
3.00E-10
3.00E-10
2.00E-10
2.00E-10
1.00E-10
0.00E+00
2.00E-10
2.00E-10
0.00E+00
2.00E-10
2.00E-10
Total Dose (krad(Si))
10
20
30
2.00E-10 2.00E-10 1.00E-10
8.00E-10 1.00E-10 0.00E+00
0.00E+00 2.00E-10 1.00E-10
0.00E+00 0.00E+00 0.00E+00
0.00E+00 1.00E-10 0.00E+00
6.00E-10 0.00E+00 0.00E+00
8.00E-10 0.00E+00 2.00E-10
1.00E-10 1.00E-10 2.00E-10
0.00E+00 0.00E+00 2.00E-10
0.00E+00 2.00E-10 3.00E-10
2.00E-10 1.00E-10 2.00E-10
2.20E-10
8.37E-11
4.49E-10
-9.41E-12
2.00E-10
3.46E-10
1.15E-09
-7.50E-10
1.20E-10
8.37E-11
3.49E-10
-1.09E-10
1.20E-10
1.10E-10
4.20E-10
-1.80E-10
1.00E-08
PASS
3.00E-10
3.74E-10
1.33E-09
-7.26E-10
1.00E-08
PASS
6.00E-11
8.94E-11
3.05E-10
-1.85E-10
1.00E-08
PASS
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Final Report
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6.0. Summary / Conclusions
The low dose rate total ionizing dose testing described in this final report was performed using the
facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. For the low
dose rate ELDRS testing described in this report, the devices were placed approximately 2-meters from
the Co-60 rods to achieve the required 10mrad(Si)/s dose rate. Samples of the RH1011 voltage
comparator described in this report were irradiated biased with a split 12V supply and unbiased (all
leads tied to ground). The devices were irradiated to a maximum total ionizing dose level of 50krad(Si)
with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si). Electrical
testing occurred within one hour following the end of each irradiation segment. For intermediate
irradiations, the units were tested and returned to total dose exposure within two hours from the end of
the previous radiation increment. In addition, all units-under-test received a 24hr room temperature
and168hr 100°C anneal, using the same bias conditions as the radiation exposure.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
were presented in this report. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to
determine the outcome of the testing: following the radiation exposure each parameter had to pass the
specification value and the average value for the ten-piece sample must pass the specification value
when the KTL limits are applied. If these conditions were not both satisfied following the radiation
exposure, then the lot would be logged as an RLAT failure.
Based on these criteria, the RH1011 voltage comparator discussed in this report passed the ELDRS test
to the highest level tested of 50krad(Si). The following minor exceptions should be noted: AVOL was
“out of specification” post-irradiation (10 and 20krad(Si) read points) and after application of the KTL
statistics due to measurement precision limitations. However, the KTL statistics actually improved for
AVOL with increasing radiation dose such that this parameter was within specification at the highest
total dose of 50krad(Si). Similarly, the average values of the input offset voltage with the KTL statistics
applied are outside of the specification due to the large standard deviation of the sample population
relative to the pre-irradiation VOS limit of 1.5mV. If any of these exceptions are a concern, we believe
this lot could be qualified to the same statistical limits without any exceptions using a lot-tolerancepercent-defective (LTPD) approach.
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Final Report
R1.3 080916
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Appendix A: TID Bias Connections
Biased Samples:
Pin
1
2
3
4
5
6
7
8
Function
GROUND
+INPUT
-INPUT
VBALANCE
BALANCE/STROBE
OUTPUT
V+
Bias
GND
5.1kΩ to +12V
GND
12Ω to -12V
N/C
N/C
5.1kΩ to +12V
12Ω to +12V
Function
GROUND
+INPUT
-INPUT
VBALANCE
BALANCE/STROBE
OUTPUT
V+
Bias
GND
GND
GND
GND
GND
GND
GND
GND
Unbiased Samples:
Pin
1
2
3
4
5
6
7
8
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Final Report
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Figure A.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5012 REV. L “MICROCIRCUIT,
LINEAR, MFG RH1011, VOLTAGE COMPARATOR”.
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Final Report
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Appendix B: Photograph of device-under-test to show part markings
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Final Report
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests are conducted using the LTS-2101 Linear Family Board, LTS-0608
Comparator Socket Assembly and DUT board. The measured parameters and test conditions are shown
in Table C.1
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where
the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation.
If necessary, larger samples sizes could be used to qualify these parameters using an “attributes”
approach.
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Table C.1. Measured parameters and test conditions for the RH1011H.
TEST
NUMBER
TEST
DESCRIPTION
TEST
CONDITIONS
1
Positive Supply Current
V+=15V, V-=-15V and VGND=0
2
Negative Supply Current
V+=15V, V-=-15V and VGND=0
3
Input Offset Voltage
4
Input Offset Current
5
+ Input Bias Current
6
- Input Bias Current
7
Large Signal Voltage Gain
V+=15V, V-=-15V, Output is Sinking 1.5mA with
VOUT=0V
V+=15V, V-=-15V, Output is Sinking 1.5mA with
VOUT=0V
V+=15V, V-=-15V, Output is Sinking 1.5mA with
VOUT=0V
V+=15V, V-=-15V, Output is Sinking 1.5mA with
VOUT=0V
V+=15V, V-=-15V, R=1kΩ to +15V, -10V <
VOUT < +14.5V
8
Common Mode Rejection Ratio
V+=15V, V-=-15V, Common Mode Swing of ±10V
9
Strobe Current
Minimum to ensure output transistor turned off.
10
Output Sat Voltage @ 8mA
VIN=-5mV and ISINK=8mA
Output Sat Voltage @ 50mA
VIN=0 and ISINK =50mA
Output Leakage Current
V+=15V, V-=-15V, VIN=5mV, VGND=-15V,
VOUT=20V
11
12
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Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution
for the RH1011H.
Measured Parameter
Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current
4.0mA
±7.34E-05A
Negative Supply
Current
-2.5mA
±4.69E-05A
Input Offset Voltage
±1.5mV
±1.99E-05V
Input Offset Current
±4.0nA
±2.44E-10A
+ Input Bias Current
-50nA
±6.30E-10A
- Input Bias Current
-50nA
±2.05E-10A
200V/mV
±5.17E+02V/mV
90dB
±5.94E+00dB
-500μA
±6.84E-05A
0.4V
±1.74E-03V
1.5V
±8.40E-03V
10nA
±1.74E-10A
Large Signal Voltage
Gain
Common Mode
Rejection Ratio
Strobe Current
Output Sat Voltage @
8mA
Output Sat Voltage @
50mA
Output Leakage
Current
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