RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Test (RLAT) of the RH119W High Performance Dual Comparator for Linear Technology Customer: Linear Technology, PO 50963L RAD Job Number: 08-279 Part Type Tested: Linear Technology RH119W High Performance Dual Comparator Commercial Part Number: RH119W Traceability Information: FAB #F0258.1, Wafer 18, Lot #472013.1 Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit. External Traveler: None required Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD, Inc. TID Dose Rate and Maximum Total Dose: 50 to 300rad(Si)/s to 200krad(Si) total ionizing dose TID Test Increments: Pre-Irradiation, 20krad(Si), 50krad(Si) 100krad(Si) and 200krad(Si) TID Overtest and Post-Irradiation Anneal: No overtest. No anneal. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Hardware and Software: LTS2020 tester, TS-04 Calibration Date: 11-03-08, Calibration Due: 05-03-09. Test program: RH119JH.SRC TID Bias Conditions: Serial numbers 694, 695, 698, 699 and 700, were biased during irradiation, serial numbers 701, 702, 704, 705 and 706 were unbiased during irradiation and serial number 1280 was used as the control. Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using their JLSA 81-24 Co60 cell. Dosimetry performed using CaF TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5 Irradiation and Test Temperature: Ambient, room temperature RLAT Result: Units passed with only minor degradation to the input offset and input bias parameters and no significant degradation to any other measured parameter. An ISO 9001:2000 Certified Company 1 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2000 Certified Company 2 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2000 Certified Company 3 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH119W dual comparators described in this final report were irradiated using a split 15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix A for the full bias circuits and electrical connections during the radiation exposure. These bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 20, 50, 100 and 200krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum enclosure was determined based on TLD dosimetry measurements (see previous section). The final dose rate for this work was 64rad(Si)/s with a precision of ±5%. An ISO 9001:2000 Certified Company 4 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the radiation lot acceptance testing the pre- and post-irradiation electrical parameters measured were: 1. Input Offset Voltage, VOS1 and VOS2 2. Common Mode Rejection Ratio, CMRR1 and CMRR2 3. Input Offset Current, IOS1 and IOS2 4. Input Bias Current, Non-Inverting Input, +IB1 and +IB2 5. Input Bias Current, Inverting Input, -IB1and -IB2 6. Large Signal Voltage Gain, AVOL1, AVOL2 7. Saturation Voltage, VSAT1 and VSAT2 8. Saturation Voltage, VSAT3 and VSAT4 9. Output Leakage Current, ICEX1 and ICEX2 10. Positive Supply Current, +IS 11. Negative Supply Current, -IS The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the TID testing: following the radiation exposure the units shall pass the specification value and the average value for the each device must pass the specification value when the KTL limits are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot could be logged as an RLAT failure. An ISO 9001:2000 Certified Company 5 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 5.0. Total Ionizing Dose Test Results The units passed the radiation lot acceptance test with only minor degradation to the input offset and input bias parameters and no significant degradation to any other measured parameter. Figures 5.1 and 5.22 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.22 show the corresponding raw data for each of these parameters. In the data plots the solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. As seen clearly in these figures and tables, the pre-irradiation data is well within the specification and the control sample remains stable during the course of the measurements. Therefore, we can conclude that any of the observed degradation was due to the radiation exposure. An ISO 9001:2000 Certified Company 6 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Positive Supply Current (A); +/-15V 1.40E-02 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.1. Plot of positive supply current versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 7 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.1. Raw data of the positive supply current versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current (A); +/-15V Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 7.28E-03 7.28E-03 7.58E-03 7.45E-03 7.31E-03 7.36E-03 7.37E-03 7.20E-03 7.21E-03 7.28E-03 7.25E-03 20 7.28E-03 7.27E-03 7.58E-03 7.44E-03 7.30E-03 7.32E-03 7.34E-03 7.19E-03 7.19E-03 7.27E-03 7.24E-03 50 7.28E-03 7.25E-03 7.57E-03 7.42E-03 7.28E-03 7.36E-03 7.36E-03 7.19E-03 7.21E-03 7.28E-03 7.24E-03 100 7.25E-03 7.24E-03 7.54E-03 7.41E-03 7.25E-03 7.36E-03 7.36E-03 7.19E-03 7.20E-03 7.25E-03 7.24E-03 200 7.26E-03 7.23E-03 7.53E-03 7.39E-03 7.25E-03 7.36E-03 7.37E-03 7.18E-03 7.21E-03 7.28E-03 7.26E-03 7.38E-03 1.32E-04 7.74E-03 7.02E-03 7.37E-03 1.34E-04 7.74E-03 7.01E-03 7.36E-03 1.35E-04 7.73E-03 6.99E-03 7.34E-03 1.33E-04 7.70E-03 6.97E-03 7.33E-03 1.27E-04 7.68E-03 6.98E-03 7.28E-03 7.26E-03 7.28E-03 7.27E-03 7.28E-03 8.02E-05 7.05E-05 8.03E-05 8.35E-05 8.57E-05 7.50E-03 7.46E-03 7.50E-03 7.50E-03 7.52E-03 7.06E-03 7.07E-03 7.06E-03 7.04E-03 7.04E-03 1.15E-02 1.15E-02 1.15E-02 1.15E-02 1.15E-02 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Negative Supply Current (A); +/- 15V 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 -3.00E-03 -3.50E-03 -4.00E-03 -4.50E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.2. Plot of negative supply current versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 9 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.2. Raw data for the negative supply current versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current (A); +/- 15V Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -3.17E-03 -3.15E-03 -3.28E-03 -3.23E-03 -3.17E-03 -3.17E-03 -3.19E-03 -3.11E-03 -3.12E-03 -3.16E-03 -3.15E-03 20 -3.16E-03 -3.14E-03 -3.27E-03 -3.22E-03 -3.16E-03 -3.17E-03 -3.19E-03 -3.10E-03 -3.11E-03 -3.16E-03 -3.15E-03 50 -3.16E-03 -3.14E-03 -3.27E-03 -3.22E-03 -3.15E-03 -3.17E-03 -3.19E-03 -3.11E-03 -3.12E-03 -3.15E-03 -3.16E-03 100 -3.15E-03 -3.14E-03 -3.25E-03 -3.21E-03 -3.15E-03 -3.17E-03 -3.19E-03 -3.11E-03 -3.12E-03 -3.16E-03 -3.15E-03 200 -3.15E-03 -3.14E-03 -3.25E-03 -3.21E-03 -3.15E-03 -3.17E-03 -3.19E-03 -3.10E-03 -3.12E-03 -3.16E-03 -3.16E-03 -3.20E-03 -3.19E-03 -3.19E-03 -3.18E-03 -3.18E-03 5.39E-05 5.39E-05 5.54E-05 4.80E-05 4.80E-05 -3.05E-03 -3.04E-03 -3.04E-03 -3.05E-03 -3.05E-03 -3.35E-03 -3.34E-03 -3.34E-03 -3.31E-03 -3.31E-03 -3.15E-03 3.39E-05 -3.06E-03 -3.24E-03 -4.50E-03 PASS -3.15E-03 3.91E-05 -3.04E-03 -3.25E-03 -4.50E-03 PASS -3.15E-03 3.35E-05 -3.06E-03 -3.24E-03 -4.50E-03 PASS An ISO 9001:2000 Certified Company 10 -3.15E-03 3.39E-05 -3.06E-03 -3.24E-03 -4.50E-03 PASS -3.15E-03 3.70E-05 -3.05E-03 -3.25E-03 -4.50E-03 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-02 Input Offset Voltage 1 (V) 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 -2.00E-03 -4.00E-03 -6.00E-03 -8.00E-03 -1.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.3. Plot of input offset voltage (comparator 1) versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 11 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.3. Raw data of input offset voltage (comparator 1) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 (V) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.10E-04 3.00E-04 5.20E-04 5.10E-04 5.00E-04 3.40E-04 5.00E-04 3.90E-04 5.50E-04 7.80E-04 6.90E-04 20 4.50E-04 3.20E-04 5.40E-04 5.40E-04 5.20E-04 3.30E-04 4.60E-04 3.60E-04 5.50E-04 7.80E-04 7.10E-04 50 4.60E-04 3.20E-04 5.30E-04 5.50E-04 4.50E-04 3.30E-04 4.70E-04 3.40E-04 5.40E-04 7.70E-04 6.90E-04 100 4.40E-04 3.30E-04 5.20E-04 4.90E-04 5.00E-04 2.80E-04 4.40E-04 3.10E-04 5.20E-04 7.60E-04 7.00E-04 200 4.50E-04 3.10E-04 5.40E-04 5.30E-04 5.20E-04 2.50E-04 4.40E-04 3.00E-04 5.00E-04 7.20E-04 7.00E-04 4.48E-04 9.36E-05 7.05E-04 1.91E-04 4.74E-04 9.37E-05 7.31E-04 2.17E-04 4.62E-04 9.04E-05 7.10E-04 2.14E-04 4.56E-04 7.64E-05 6.65E-04 2.47E-04 4.70E-04 9.62E-05 7.34E-04 2.06E-04 5.12E-04 1.72E-04 9.83E-04 4.13E-05 -4.00E-03 PASS 4.00E-03 PASS 4.96E-04 1.81E-04 9.92E-04 -6.71E-08 -4.00E-03 PASS 4.00E-03 PASS 4.90E-04 1.80E-04 9.83E-04 -3.18E-06 -4.00E-03 PASS 4.00E-03 PASS 4.62E-04 1.93E-04 9.91E-04 -6.70E-05 -4.00E-03 PASS 4.00E-03 PASS 4.42E-04 1.86E-04 9.51E-04 -6.67E-05 -8.00E-03 PASS 8.00E-03 PASS An ISO 9001:2000 Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-02 Iniput Offset Voltage 2 (V) 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 -2.00E-03 -4.00E-03 -6.00E-03 -8.00E-03 -1.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.4. Plot of input offset voltage (comparator 2) versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 13 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.4. Raw data of input offset voltage (comparator 2) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Iniput Offset Voltage 2 (V) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.40E-04 9.10E-04 4.30E-04 2.90E-04 8.50E-04 6.10E-04 3.80E-04 6.00E-04 3.60E-04 6.80E-04 5.80E-04 20 4.90E-04 9.60E-04 4.30E-04 3.30E-04 8.80E-04 6.00E-04 3.80E-04 6.00E-04 3.60E-04 6.90E-04 5.90E-04 50 5.00E-04 9.70E-04 4.30E-04 3.50E-04 9.00E-04 5.90E-04 3.80E-04 5.90E-04 3.50E-04 6.80E-04 6.00E-04 100 5.10E-04 9.90E-04 4.60E-04 3.30E-04 9.10E-04 5.90E-04 3.60E-04 5.80E-04 3.40E-04 6.80E-04 5.90E-04 200 5.10E-04 9.70E-04 4.70E-04 3.60E-04 9.10E-04 5.70E-04 3.50E-04 5.70E-04 3.30E-04 6.60E-04 5.90E-04 5.84E-04 6.18E-04 6.30E-04 6.40E-04 6.44E-04 2.77E-04 2.83E-04 2.85E-04 2.92E-04 2.77E-04 1.34E-03 1.39E-03 1.41E-03 1.44E-03 1.40E-03 -1.77E-04 -1.58E-04 -1.50E-04 -1.60E-04 -1.14E-04 5.26E-04 5.26E-04 5.18E-04 5.10E-04 4.96E-04 1.46E-04 1.47E-04 1.45E-04 1.51E-04 1.47E-04 9.26E-04 9.30E-04 9.15E-04 9.25E-04 9.00E-04 1.26E-04 1.22E-04 1.21E-04 9.51E-05 9.23E-05 -4.00E-03 -4.00E-03 -4.00E-03 -4.00E-03 -8.00E-03 PASS PASS PASS PASS PASS 4.00E-03 4.00E-03 4.00E-03 4.00E-03 8.00E-03 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-07 Input Offset Current 1 (A) 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 0 50 100 150 Total Dose (krad(Si)) Figure 5.5. Plot of input offset current (comparator 1) versus total dose. The data show a modest degradation with total dose, however it stays within specification to the maximum total dose tested. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 15 200 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.5. Raw data of input offset current (comparator 1) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 1 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 20 50 100 200 1.92E-08 1.46E-08 2.43E-08 1.97E-08 -1.39E-08 1.76E-08 8.75E-09 3.91E-09 -2.00E-11 3.79E-09 2.20E-08 2.39E-08 4.06E-08 6.08E-09 -1.74E-08 2.66E-08 2.33E-08 2.18E-08 4.75E-08 -1.42E-08 2.16E-08 1.09E-08 9.16E-08 2.39E-08 -5.85E-09 2.78E-08 2.51E-08 3.81E-08 4.72E-08 6.35E-08 2.85E-08 3.21E-08 4.97E-08 6.48E-08 8.55E-08 2.39E-08 2.57E-08 3.79E-08 4.82E-08 6.80E-08 1.31E-08 2.12E-08 2.84E-08 3.70E-08 4.78E-08 1.85E-08 2.37E-08 3.28E-08 5.00E-08 7.48E-08 -6.61E-09 -3.80E-09 -7.14E-09 -7.82E-09 -7.22E-09 2.14E-08 1.63E-08 3.64E-08 1.94E-08 -9.51E-09 3.43E-09 6.99E-09 3.35E-08 1.85E-08 8.57E-09 3.08E-08 3.55E-08 1.28E-07 7.01E-08 1.40E-08 1.20E-08 -2.89E-09 -5.53E-08 -3.12E-08 -3.30E-08 2.24E-08 2.56E-08 3.74E-08 4.94E-08 6.79E-08 6.54E-09 4.04E-09 7.97E-09 9.96E-09 1.40E-08 4.03E-08 3.66E-08 5.92E-08 7.67E-08 1.06E-07 4.42E-09 1.45E-08 1.55E-08 2.21E-08 2.96E-08 -7.50E-08 -1.00E-07 -1.50E-07 -3.00E-07 -5.00E-07 PASS PASS PASS PASS PASS 7.50E-08 1.00E-07 1.50E-07 3.00E-07 5.00E-07 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-07 Input Offset Current 2 (A) 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 0 50 100 150 Total Dose (krad(Si)) Figure 5.6. Plot of input offset current (comparator 2) versus total dose. The data show a modest degradation with total dose, however it stays within specification to the maximum total dose tested. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 17 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.6. Raw data of input offset current (comparator 2) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.93E-08 -3.18E-08 -3.57E-08 -3.27E-08 -3.31E-08 -4.01E-08 -3.37E-08 -3.81E-08 -3.61E-08 -3.81E-08 -1.08E-08 20 -4.84E-08 -5.29E-08 -5.22E-08 -4.81E-08 -5.54E-08 -3.92E-08 -3.76E-08 -3.96E-08 -3.66E-08 -4.02E-08 -1.23E-08 50 -5.83E-08 -7.04E-08 -8.66E-08 -7.31E-08 -7.56E-08 -4.75E-08 -4.89E-08 -5.95E-08 -4.27E-08 -5.40E-08 -1.12E-08 100 -7.85E-08 -9.93E-08 -9.75E-08 -1.12E-07 -1.06E-07 -6.14E-08 -6.26E-08 -6.78E-08 -5.75E-08 -6.84E-08 -1.19E-08 200 -1.39E-07 -1.09E-07 -1.36E-07 -1.52E-07 -1.55E-07 -7.68E-08 -7.56E-08 -8.11E-08 -7.26E-08 -8.97E-08 -1.18E-08 -3.25E-08 -5.14E-08 -7.28E-08 -9.88E-08 -1.38E-07 2.31E-09 3.12E-09 1.02E-08 1.27E-08 1.86E-08 -2.62E-08 -4.28E-08 -4.50E-08 -6.38E-08 -8.71E-08 -3.89E-08 -5.99E-08 -1.01E-07 -1.34E-07 -1.89E-07 -3.72E-08 2.44E-09 -3.05E-08 -4.39E-08 -7.50E-08 PASS 7.50E-08 PASS -3.86E-08 1.47E-09 -3.46E-08 -4.27E-08 -1.00E-07 PASS 1.00E-07 PASS -5.05E-08 6.44E-09 -3.28E-08 -6.82E-08 -1.50E-07 PASS 1.50E-07 PASS An ISO 9001:2000 Certified Company 18 -6.35E-08 4.55E-09 -5.10E-08 -7.60E-08 -3.00E-07 PASS 3.00E-07 PASS -7.92E-08 6.63E-09 -6.10E-08 -9.73E-08 -5.00E-07 PASS 5.00E-07 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-06 Positive Bias Current 1 (A) 2.00E-06 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 -2.50E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.7. Plot of input bias current, non-inverting input (comparator 1) versus total dose. The data show a modest degradation with total dose, however it stays within specification to the maximum total dose tested. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 19 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.5. Raw data of input bias current, non-inverting input (comparator 1) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Bias Current 1 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status PASS PASS 0 3.18E-07 2.99E-07 3.27E-07 3.36E-07 3.27E-07 3.14E-07 3.11E-07 3.11E-07 3.21E-07 3.09E-07 3.27E-07 20 4.01E-07 3.84E-07 4.23E-07 4.16E-07 4.15E-07 3.84E-07 3.80E-07 3.83E-07 3.89E-07 3.73E-07 3.29E-07 50 4.52E-07 4.66E-07 5.32E-07 5.16E-07 4.53E-07 4.65E-07 4.51E-07 4.64E-07 4.43E-07 4.21E-07 3.32E-07 100 5.75E-07 5.64E-07 6.05E-07 7.04E-07 5.90E-07 5.67E-07 5.63E-07 5.70E-07 5.80E-07 5.47E-07 3.30E-07 200 7.26E-07 6.67E-07 7.44E-07 7.58E-07 7.32E-07 7.09E-07 7.06E-07 7.05E-07 7.18E-07 7.31E-07 3.32E-07 3.21E-07 1.41E-08 3.60E-07 2.83E-07 4.08E-07 1.53E-08 4.50E-07 3.66E-07 4.84E-07 3.77E-08 5.87E-07 3.80E-07 6.08E-07 5.58E-08 7.60E-07 4.55E-07 7.26E-07 3.48E-08 8.21E-07 6.30E-07 3.13E-07 3.82E-07 4.49E-07 5.65E-07 7.14E-07 4.76E-09 5.84E-09 1.82E-08 1.19E-08 1.08E-08 3.26E-07 3.98E-07 4.99E-07 5.98E-07 7.43E-07 3.00E-07 3.66E-07 3.99E-07 5.33E-07 6.84E-07 -5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06 PASS PASS PASS PASS 5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-06 Positive Bias Current 2 (A) 2.00E-06 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 -2.50E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.8. Plot of input bias current, non-inverting input (comparator 2) versus total dose. The data show a modest degradation with total dose, however it stays within specification to the maximum total dose tested. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 21 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.6. Raw data of input bias current, non-inverting input (comparator 2) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Bias Current 2 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.47E-07 3.24E-07 3.57E-07 3.62E-07 3.56E-07 3.47E-07 3.43E-07 3.45E-07 3.44E-07 3.38E-07 3.36E-07 20 4.42E-07 4.02E-07 4.55E-07 4.58E-07 4.09E-07 4.21E-07 4.16E-07 4.22E-07 4.18E-07 4.11E-07 3.36E-07 50 5.40E-07 5.20E-07 6.18E-07 5.73E-07 5.62E-07 5.20E-07 5.19E-07 5.43E-07 4.63E-07 5.11E-07 3.35E-07 100 6.51E-07 6.34E-07 6.82E-07 8.04E-07 6.81E-07 6.34E-07 6.44E-07 6.51E-07 6.35E-07 6.28E-07 3.36E-07 200 8.29E-07 7.53E-07 8.29E-07 8.61E-07 8.46E-07 7.96E-07 8.13E-07 8.15E-07 7.93E-07 8.47E-07 3.36E-07 3.49E-07 1.53E-08 3.91E-07 3.07E-07 4.33E-07 2.60E-08 5.04E-07 3.62E-07 5.63E-07 3.69E-08 6.64E-07 4.61E-07 6.90E-07 6.67E-08 8.73E-07 5.08E-07 8.24E-07 4.15E-08 9.37E-07 7.10E-07 3.43E-07 4.18E-07 5.11E-07 6.39E-07 8.13E-07 3.24E-09 4.46E-09 2.93E-08 9.18E-09 2.14E-08 3.52E-07 4.30E-07 5.91E-07 6.64E-07 8.72E-07 3.34E-07 4.05E-07 4.31E-07 6.13E-07 7.54E-07 -5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06 PASS PASS PASS PASS PASS 5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-06 Negative Bias Current 1 (A) 2.00E-06 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 -2.50E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.9. Plot of input bias current, inverting input (comparator 1) versus total dose. The data show a modest degradation with total dose, however it stays within specification to the maximum total dose tested. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 23 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.7. Raw data for the input bias current, inverting input (comparator 1) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Bias Current 1 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.37E-07 3.15E-07 3.46E-07 3.61E-07 3.44E-07 3.42E-07 3.40E-07 3.38E-07 3.35E-07 3.23E-07 3.21E-07 20 4.15E-07 3.90E-07 4.50E-07 4.43E-07 4.24E-07 4.10E-07 4.12E-07 4.09E-07 4.05E-07 3.96E-07 3.22E-07 50 5.07E-07 4.75E-07 5.51E-07 5.35E-07 5.43E-07 5.06E-07 5.08E-07 5.03E-07 5.01E-07 4.88E-07 3.20E-07 100 5.41E-07 5.31E-07 6.14E-07 7.52E-07 6.15E-07 6.15E-07 6.27E-07 6.17E-07 6.13E-07 5.73E-07 3.20E-07 200 7.13E-07 6.75E-07 7.22E-07 7.47E-07 7.28E-07 7.70E-07 7.94E-07 7.77E-07 7.64E-07 8.04E-07 3.22E-07 3.40E-07 1.68E-08 3.86E-07 2.94E-07 4.25E-07 2.38E-08 4.90E-07 3.59E-07 5.22E-07 3.13E-08 6.08E-07 4.36E-07 6.11E-07 8.82E-08 8.52E-07 3.69E-07 7.17E-07 2.66E-08 7.90E-07 6.44E-07 3.36E-07 4.06E-07 5.01E-07 6.09E-07 7.82E-07 7.51E-09 6.55E-09 7.88E-09 2.08E-08 1.68E-08 3.56E-07 4.24E-07 5.23E-07 6.66E-07 8.28E-07 3.15E-07 3.88E-07 4.80E-07 5.52E-07 7.36E-07 -5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06 PASS PASS PASS PASS PASS 5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-06 Negative Bias Current 2 (A) 2.00E-06 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 -2.50E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.10. Plot of input bias current, inverting input (comparator 2) versus total dose. The data show a modest degradation with total dose, however it stays within specification to the maximum total dose tested. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 25 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.10. Raw data for the input bias current, inverting input (comparator 2) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Bias Current 2 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 3.18E-07 2.90E-07 3.22E-07 3.27E-07 3.22E-07 3.07E-07 3.09E-07 3.04E-07 3.05E-07 3.00E-07 3.22E-07 20 3.94E-07 3.66E-07 4.21E-07 4.09E-07 4.02E-07 3.79E-07 3.78E-07 3.81E-07 3.79E-07 3.71E-07 3.21E-07 50 4.80E-07 4.49E-07 5.30E-07 4.99E-07 4.85E-07 4.69E-07 4.70E-07 4.81E-07 4.68E-07 4.56E-07 3.22E-07 100 5.49E-07 5.34E-07 5.44E-07 6.90E-07 5.74E-07 5.57E-07 5.34E-07 5.55E-07 5.31E-07 5.60E-07 3.21E-07 200 6.90E-07 5.95E-07 6.94E-07 7.05E-07 6.90E-07 7.17E-07 7.37E-07 7.33E-07 7.20E-07 7.53E-07 3.23E-07 3.16E-07 1.49E-08 3.57E-07 2.75E-07 3.98E-07 2.07E-08 4.55E-07 3.42E-07 4.89E-07 2.93E-08 5.69E-07 4.08E-07 5.78E-07 6.44E-08 7.55E-07 4.02E-07 6.75E-07 4.51E-08 7.98E-07 5.51E-07 3.05E-07 3.77E-07 4.68E-07 5.48E-07 7.32E-07 3.51E-09 3.96E-09 8.84E-09 1.38E-08 1.42E-08 3.15E-07 3.88E-07 4.93E-07 5.85E-07 7.71E-07 2.95E-07 3.66E-07 4.44E-07 5.10E-07 6.93E-07 -5.00E-07 -7.50E-07 -1.00E-06 -1.50E-06 -2.00E-06 PASS PASS PASS PASS PASS 5.00E-07 7.50E-07 1.00E-06 1.50E-06 2.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN 9.00E+01 Open Loop Gain 1 (V/mV) 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.11. Plot of open loop gain (comparator 1) versus total dose using the datasheet units of V/mV. The data show no significant degradation with total dose, however the KTL statistics are erratic due to the sensitivity of the measurement to input conditions and the limitations of the test equipment. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 27 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.11. Raw data for the open loop gain (comparator 1) versus total dose using the datasheet units of V/mV, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 (V/mV) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 7.86E+01 8.78E+01 5.58E+01 6.69E+01 7.03E+01 7.55E+01 5.87E+01 7.71E+01 7.31E+01 7.15E+01 9.97E+01 20 6.70E+01 9.16E+01 7.08E+01 7.85E+01 8.67E+01 7.57E+01 8.25E+01 6.86E+01 9.54E+01 9.14E+01 7.16E+01 50 7.63E+01 7.49E+01 8.05E+01 8.23E+01 7.57E+01 7.80E+01 7.86E+01 6.68E+01 7.00E+01 1.16E+02 7.74E+01 100 8.93E+01 7.60E+01 7.93E+01 7.33E+01 8.62E+01 9.08E+01 6.86E+01 6.66E+01 8.64E+01 7.93E+01 5.53E+01 200 7.69E+01 8.78E+01 8.55E+01 7.77E+01 8.54E+01 8.07E+01 7.09E+01 9.12E+01 6.99E+01 6.93E+01 5.40E+01 7.19E+01 1.21E+01 1.05E+02 3.87E+01 7.89E+01 1.04E+01 1.07E+02 5.05E+01 7.79E+01 3.26E+00 8.69E+01 6.90E+01 8.08E+01 6.76E+00 9.94E+01 6.23E+01 8.27E+01 4.99E+00 9.64E+01 6.90E+01 7.12E+01 7.30E+00 9.12E+01 5.12E+01 1.00E+01 PASS 8.27E+01 1.10E+01 1.13E+02 5.25E+01 1.00E+01 PASS 8.18E+01 1.95E+01 1.35E+02 2.82E+01 1.00E+01 PASS 7.83E+01 1.07E+01 1.08E+02 4.91E+01 1.00E+01 PASS 7.64E+01 9.49E+00 1.02E+02 5.04E+01 5.00E+00 PASS An ISO 9001:2000 Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN 1.05E+02 1.00E+02 Open Loop Gain 1 (dB) 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.12. Plot of open loop gain (comparator 1) versus total dose using units of dB. The data show no significant degradation with total dose. Note that using units of dB to measure the gain (a commonly used unit for this measurement) removes the erratic behavior of the KTL statistics observed in Figure 5.11. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 29 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.12. Raw data for the open loop gain (comparator 1) versus total dose using units of dB, including the statistical analysis, the specification and the status of the testing (pass/fail). Open Loop Gain 1 (dB) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 97.91 98.87 94.93 96.51 96.94 97.56 95.37 97.74 97.28 97.09 99.97 9.70E+01 1.49E+00 1.01E+02 9.30E+01 9.70E+01 9.48E-01 9.96E+01 9.44E+01 8.00E+01 PASS Total Dose (krad(Si)) 20 50 100 96.52 97.65 99.02 99.24 97.49 97.62 97.00 98.12 97.99 97.90 98.31 97.30 98.76 97.58 98.71 97.58 97.84 99.16 98.33 97.91 96.73 96.73 96.50 96.47 99.59 96.90 98.73 99.22 101.25 97.99 97.10 97.77 94.85 9.79E+01 9.78E+01 9.81E+01 9.83E+01 1.14E+00 3.61E-01 7.23E-01 5.30E-01 1.01E+02 9.88E+01 1.00E+02 9.98E+01 9.47E+01 9.68E+01 9.61E+01 9.69E+01 9.83E+01 1.17E+00 1.02E+02 9.51E+01 8.00E+01 PASS 9.81E+01 1.87E+00 1.03E+02 9.29E+01 8.00E+01 PASS An ISO 9001:2000 Certified Company 30 200 97.72 98.87 98.64 97.81 98.63 98.14 97.01 99.20 96.89 96.81 94.65 9.78E+01 1.19E+00 1.01E+02 9.45E+01 8.00E+01 PASS 9.76E+01 1.04E+00 1.00E+02 9.48E+01 7.40E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN 1.00E+02 9.00E+01 Open Loop Gain 2 (V/mV) 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.13. Plot of open loop gain (comparator 2) versus total dose using the datasheet units of V/mV. The data show no significant degradation with total dose, however the KTL statistics are erratic due to the sensitivity of the measurement to input conditions and the limitations of the test equipment. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 31 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.13. Raw data for the open loop gain (comparator 2) versus total dose using the datasheet units of V/mV, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 (V/mV) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 9.15E+01 7.74E+01 7.24E+01 7.92E+01 7.31E+01 7.84E+01 9.33E+01 8.55E+01 9.00E+01 7.40E+01 9.40E+01 20 1.08E+02 7.74E+01 6.56E+01 8.97E+01 1.01E+02 7.00E+01 9.28E+01 9.14E+01 8.07E+01 7.65E+01 8.55E+01 50 9.02E+01 7.65E+01 7.25E+01 9.04E+01 7.57E+01 8.44E+01 6.95E+01 8.03E+01 8.26E+01 8.03E+01 9.40E+01 100 9.82E+01 7.65E+01 8.29E+01 7.86E+01 8.13E+01 9.54E+01 6.88E+01 8.13E+01 9.04E+01 6.79E+01 1.06E+02 200 7.31E+01 8.90E+01 9.51E+01 6.77E+01 8.44E+01 8.90E+01 7.95E+01 9.02E+01 6.79E+01 6.65E+01 8.78E+01 7.87E+01 7.69E+00 9.98E+01 5.76E+01 8.84E+01 1.72E+01 1.36E+02 4.11E+01 8.11E+01 8.57E+00 1.05E+02 5.76E+01 8.35E+01 8.58E+00 1.07E+02 6.00E+01 8.19E+01 1.13E+01 1.13E+02 5.09E+01 8.42E+01 8.00E+00 1.06E+02 6.23E+01 1.00E+01 PASS 8.23E+01 9.75E+00 1.09E+02 5.55E+01 1.00E+01 PASS 7.94E+01 5.81E+00 9.53E+01 6.35E+01 1.00E+01 PASS 8.08E+01 1.24E+01 1.15E+02 4.67E+01 1.00E+01 PASS 7.86E+01 1.12E+01 1.09E+02 4.78E+01 5.00E+00 PASS An ISO 9001:2000 Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN 1.05E+02 1.00E+02 Open Loop Gain 2 (dB) 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.14. Plot of open loop gain (comparator 2) versus total dose using units of dB. The data show no significant degradation with total dose. Note that using units of dB to measure the gain (a commonly used unit for this measurement) removes the erratic behavior of the KTL statistics observed in Figure 5.13. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 33 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.14. Raw data for the open loop gain (comparator 2) versus total dose using units of dB, including the statistical analysis, the specification and the status of the testing (pass/fail). Open Loop Gain 2 (dB) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 99.23 97.77 97.19 97.97 97.28 97.89 99.40 98.64 99.08 97.38 99.46 9.79E+01 8.17E-01 1.00E+02 9.57E+01 9.85E+01 8.34E-01 1.01E+02 9.62E+01 8.00E+01 PASS Total Dose (krad(Si)) 20 50 100 100.66 99.10 99.84 97.77 97.67 97.67 96.34 97.21 98.37 99.06 99.12 97.91 100.11 97.58 98.20 96.90 98.53 99.59 99.35 96.84 96.75 99.22 98.09 98.20 98.14 98.34 99.12 97.67 98.09 96.64 98.64 99.46 100.52 9.88E+01 9.81E+01 9.84E+01 9.82E+01 1.76E+00 9.08E-01 8.50E-01 1.22E+00 1.04E+02 1.01E+02 1.01E+02 1.02E+02 9.40E+01 9.56E+01 9.61E+01 9.48E+01 9.83E+01 1.04E+00 1.01E+02 9.54E+01 8.00E+01 PASS 9.80E+01 6.62E-01 9.98E+01 9.62E+01 8.00E+01 PASS An ISO 9001:2000 Certified Company 34 200 97.28 98.99 99.56 96.61 98.53 98.99 98.01 99.10 96.64 96.46 98.87 9.81E+01 1.34E+00 1.02E+02 9.44E+01 8.00E+01 PASS 9.78E+01 1.26E+00 1.01E+02 9.44E+01 7.40E+01 PASS Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Common Mode Rejection Ratio 1 (dB) 1.50E+02 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.15. Plot of common mode rejection ratio (comparator 1) versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 35 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.15. Raw data for the common mode rejection ratio (comparator 1), including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 (dB) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.36E+02 1.28E+02 1.18E+02 1.22E+02 1.30E+02 1.28E+02 1.15E+02 1.23E+02 1.24E+02 1.23E+02 1.15E+02 20 1.34E+02 1.39E+02 1.17E+02 1.48E+02 1.34E+02 1.21E+02 1.14E+02 1.21E+02 1.18E+02 1.21E+02 1.13E+02 50 1.24E+02 1.20E+02 1.28E+02 1.26E+02 1.31E+02 1.23E+02 1.16E+02 1.17E+02 1.13E+02 1.23E+02 1.19E+02 100 1.26E+02 1.19E+02 1.27E+02 1.46E+02 1.28E+02 1.21E+02 1.14E+02 1.20E+02 1.15E+02 1.29E+02 1.17E+02 200 1.40E+02 1.58E+02 1.39E+02 1.42E+02 1.28E+02 1.21E+02 1.16E+02 1.20E+02 1.20E+02 1.34E+02 1.21E+02 1.27E+02 7.25E+00 1.47E+02 1.07E+02 1.35E+02 1.14E+01 1.66E+02 1.03E+02 1.26E+02 4.22E+00 1.37E+02 1.14E+02 1.29E+02 1.01E+01 1.57E+02 1.02E+02 1.42E+02 1.10E+01 1.72E+02 1.11E+02 1.23E+02 4.95E+00 1.36E+02 1.09E+02 9.00E+01 PASS 1.19E+02 3.13E+00 1.28E+02 1.11E+02 9.00E+01 PASS 1.18E+02 4.30E+00 1.30E+02 1.07E+02 9.00E+01 PASS 1.20E+02 6.00E+00 1.37E+02 1.04E+02 9.00E+01 PASS 1.22E+02 6.97E+00 1.41E+02 1.03E+02 9.00E+01 PASS An ISO 9001:2000 Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Common Mode Rejection Ratio 2 (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.16. Plot of common mode rejection ratio (comparator 2) versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 37 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.16. Raw data for the common mode rejection ratio (comparator 2) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 (dB) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.12E+02 1.30E+02 1.19E+02 1.15E+02 1.14E+02 1.32E+02 1.13E+02 1.19E+02 1.24E+02 1.14E+02 1.34E+02 20 1.14E+02 1.19E+02 1.18E+02 1.14E+02 1.15E+02 1.39E+02 1.13E+02 1.18E+02 1.19E+02 1.18E+02 1.33E+02 50 1.12E+02 1.15E+02 1.19E+02 1.12E+02 1.16E+02 1.32E+02 1.13E+02 1.20E+02 1.19E+02 1.16E+02 1.39E+02 100 1.13E+02 1.25E+02 1.14E+02 1.11E+02 1.15E+02 1.32E+02 1.12E+02 1.20E+02 1.23E+02 1.15E+02 1.30E+02 200 1.15E+02 1.28E+02 1.16E+02 1.11E+02 1.15E+02 1.32E+02 1.13E+02 1.19E+02 1.21E+02 1.14E+02 1.42E+02 1.18E+02 7.29E+00 1.38E+02 9.81E+01 1.16E+02 2.36E+00 1.22E+02 1.09E+02 1.15E+02 3.15E+00 1.23E+02 1.06E+02 1.16E+02 5.51E+00 1.31E+02 1.00E+02 1.17E+02 6.59E+00 1.35E+02 9.91E+01 1.20E+02 7.58E+00 1.41E+02 9.94E+01 9.00E+01 PASS 1.21E+02 1.01E+01 1.49E+02 9.37E+01 9.00E+01 PASS 1.20E+02 7.01E+00 1.39E+02 1.01E+02 9.00E+01 PASS 1.20E+02 7.87E+00 1.42E+02 9.89E+01 9.00E+01 PASS 1.20E+02 7.77E+00 1.41E+02 9.84E+01 9.00E+01 PASS An ISO 9001:2000 Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Voltage Output Low 1 @ 3.2mA (V) 4.50E-01 4.00E-01 3.50E-01 3.00E-01 2.50E-01 2.00E-01 0 50 100 150 Total Dose (krad(Si)) Figure 5.17. Plot of the saturation voltage (VSAT) at 3.2mA for comparator 1 versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 39 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.17. Raw data for the saturation voltage (VSAT) at 3.2mA for comparator 1 versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Voltage Output Low 1 @ 3.2mA (V) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.48E-01 2.44E-01 2.44E-01 2.48E-01 2.48E-01 2.46E-01 2.42E-01 2.41E-01 2.40E-01 2.41E-01 2.51E-01 20 2.47E-01 2.44E-01 2.41E-01 2.49E-01 2.48E-01 2.45E-01 2.41E-01 2.41E-01 2.40E-01 2.40E-01 2.52E-01 50 2.48E-01 2.44E-01 2.43E-01 2.51E-01 2.50E-01 2.48E-01 2.43E-01 2.43E-01 2.42E-01 2.42E-01 2.52E-01 100 2.51E-01 2.48E-01 2.49E-01 2.51E-01 2.52E-01 2.51E-01 2.47E-01 2.46E-01 2.46E-01 2.44E-01 2.52E-01 200 2.56E-01 2.53E-01 2.53E-01 2.57E-01 2.57E-01 2.56E-01 2.52E-01 2.51E-01 2.50E-01 2.51E-01 2.52E-01 2.46E-01 2.19E-03 2.52E-01 2.40E-01 2.46E-01 3.27E-03 2.55E-01 2.37E-01 2.47E-01 3.56E-03 2.57E-01 2.37E-01 2.50E-01 1.64E-03 2.55E-01 2.46E-01 2.55E-01 2.05E-03 2.61E-01 2.50E-01 2.42E-01 2.41E-01 2.44E-01 2.47E-01 2.52E-01 2.35E-03 2.07E-03 2.51E-03 2.59E-03 2.35E-03 2.48E-01 2.47E-01 2.50E-01 2.54E-01 2.58E-01 2.36E-01 2.36E-01 2.37E-01 2.40E-01 2.46E-01 4.00E-01 4.00E-01 4.00E-01 4.00E-01 4.00E-01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Voltage Output Low 2 @ 3.2mA (V) 4.50E-01 4.00E-01 3.50E-01 3.00E-01 2.50E-01 2.00E-01 0 50 100 150 Total Dose (krad(Si)) Figure 5.18. Plot of the saturation voltage (VSAT) at 3.2mA for comparator 2 versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 41 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.18. Raw data for the saturation voltage (VSAT) at 3.2mA for comparator 2 versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Voltage Output Low 2 @ 3.2mA (V) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 2.45E-01 2.38E-01 2.41E-01 2.48E-01 2.45E-01 2.46E-01 2.43E-01 2.38E-01 2.40E-01 2.38E-01 2.51E-01 20 2.43E-01 2.38E-01 2.39E-01 2.48E-01 2.46E-01 2.43E-01 2.41E-01 2.36E-01 2.38E-01 2.36E-01 2.51E-01 50 2.46E-01 2.39E-01 2.41E-01 2.50E-01 2.47E-01 2.46E-01 2.44E-01 2.37E-01 2.41E-01 2.39E-01 2.52E-01 100 2.48E-01 2.41E-01 2.45E-01 2.50E-01 2.49E-01 2.49E-01 2.46E-01 2.41E-01 2.43E-01 2.40E-01 2.52E-01 200 2.54E-01 2.47E-01 2.49E-01 2.57E-01 2.54E-01 2.55E-01 2.52E-01 2.45E-01 2.49E-01 2.48E-01 2.52E-01 2.43E-01 3.91E-03 2.54E-01 2.33E-01 2.43E-01 4.32E-03 2.55E-01 2.31E-01 2.45E-01 4.51E-03 2.57E-01 2.32E-01 2.47E-01 3.65E-03 2.57E-01 2.37E-01 2.52E-01 4.09E-03 2.63E-01 2.41E-01 2.41E-01 2.39E-01 2.41E-01 2.44E-01 2.50E-01 3.46E-03 3.11E-03 3.65E-03 3.70E-03 3.83E-03 2.50E-01 2.47E-01 2.51E-01 2.54E-01 2.60E-01 2.32E-01 2.30E-01 2.31E-01 2.34E-01 2.39E-01 4.00E-01 4.00E-01 4.00E-01 4.00E-01 4.00E-01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Voltage Output Low 1 @ 25mA (V) 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0 50 100 150 Total Dose (krad(Si)) Figure 5.19. Plot of the saturation voltage (VSAT) at 25mA for comparator 1 versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 43 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.19. Raw data for the saturation voltage (VSAT) at 25mA for comparator 1 versus total dose versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Voltage Output Low 1 @ 25mA (V) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 6.33E-01 6.27E-01 6.22E-01 6.29E-01 6.34E-01 6.29E-01 6.17E-01 6.21E-01 6.24E-01 6.19E-01 6.43E-01 20 6.26E-01 6.22E-01 6.12E-01 6.24E-01 6.29E-01 6.28E-01 6.15E-01 6.17E-01 6.23E-01 6.15E-01 6.42E-01 50 6.28E-01 6.25E-01 6.17E-01 6.27E-01 6.32E-01 6.27E-01 6.15E-01 6.18E-01 6.26E-01 6.17E-01 6.42E-01 100 6.33E-01 6.30E-01 6.25E-01 6.31E-01 6.37E-01 6.31E-01 6.18E-01 6.22E-01 6.29E-01 6.22E-01 6.41E-01 200 6.39E-01 6.36E-01 6.31E-01 6.40E-01 6.45E-01 6.37E-01 6.26E-01 6.30E-01 6.35E-01 6.26E-01 6.40E-01 6.29E-01 4.85E-03 6.42E-01 6.16E-01 6.23E-01 6.47E-03 6.40E-01 6.05E-01 6.26E-01 5.54E-03 6.41E-01 6.11E-01 6.31E-01 4.38E-03 6.43E-01 6.19E-01 6.38E-01 5.17E-03 6.52E-01 6.24E-01 6.22E-01 6.20E-01 6.21E-01 6.24E-01 6.31E-01 4.69E-03 5.73E-03 5.50E-03 5.41E-03 5.07E-03 6.35E-01 6.35E-01 6.36E-01 6.39E-01 6.45E-01 6.09E-01 6.04E-01 6.06E-01 6.10E-01 6.17E-01 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Voltage Output Low 2 @ 25mA (V) 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0 50 100 150 Total Dose (krad(Si)) Figure 5.20. Plot of the saturation voltage (VSAT) at 25mA for comparator 2 versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the un-biased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 45 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table 5.20. Raw data of the saturation voltage (VSAT) at 25mA for comparator 2 versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Voltage Output Low 2 @ 25mA (V) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 6.24E-01 6.13E-01 6.17E-01 6.30E-01 6.19E-01 6.26E-01 6.13E-01 6.12E-01 6.20E-01 6.09E-01 6.34E-01 20 6.18E-01 6.08E-01 6.10E-01 6.25E-01 6.15E-01 6.25E-01 6.09E-01 6.09E-01 6.17E-01 6.05E-01 6.32E-01 50 6.20E-01 6.12E-01 6.12E-01 6.28E-01 6.17E-01 6.23E-01 6.10E-01 6.10E-01 6.18E-01 6.06E-01 6.32E-01 100 6.26E-01 6.16E-01 6.20E-01 6.31E-01 6.22E-01 6.27E-01 6.14E-01 6.14E-01 6.22E-01 6.12E-01 6.32E-01 200 6.32E-01 6.22E-01 6.27E-01 6.40E-01 6.31E-01 6.32E-01 6.21E-01 6.21E-01 6.28E-01 6.15E-01 6.31E-01 6.21E-01 6.58E-03 6.39E-01 6.03E-01 6.15E-01 6.76E-03 6.34E-01 5.97E-01 6.18E-01 6.65E-03 6.36E-01 6.00E-01 6.23E-01 5.74E-03 6.39E-01 6.07E-01 6.30E-01 6.66E-03 6.49E-01 6.12E-01 6.16E-01 6.13E-01 6.13E-01 6.18E-01 6.23E-01 6.89E-03 8.00E-03 6.91E-03 6.42E-03 6.66E-03 6.35E-01 6.35E-01 6.32E-01 6.35E-01 6.42E-01 5.97E-01 5.91E-01 5.94E-01 6.00E-01 6.05E-01 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX 2.50E-06 Output Leakage Current 1 (A) 2.00E-06 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 -2.50E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.21. Plot of output leakage current (comparator 1) versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 47 200 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.21. Raw data of the output leakage current (comparator 1) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Leakage Current 1 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 20 50 100 200 4.00E-09 2.00E-09 2.00E-09 2.00E-09 4.00E-09 3.00E-09 2.00E-09 3.00E-09 3.00E-09 2.00E-09 0.00E+00 1.00E-09 2.00E-09 4.00E-09 1.00E-09 2.00E-09 0.00E+00 0.00E+00 0.00E+00 4.00E-09 2.00E-09 0.00E+00 0.00E+00 2.00E-09 0.00E+00 0.00E+00 1.00E-09 2.00E-09 4.00E-09 3.00E-09 3.00E-09 1.00E-09 1.00E-09 3.00E-09 3.00E-09 0.00E+00 1.00E-09 2.00E-09 3.00E-09 4.00E-09 2.00E-09 3.00E-09 2.00E-09 0.00E+00 4.00E-09 2.00E-09 5.00E-09 2.00E-09 3.00E-09 2.00E-09 1.00E-09 0.00E+00 1.00E-09 1.00E-09 1.00E-09 2.20E-09 1.00E-09 1.40E-09 2.20E-09 2.20E-09 1.48E-09 1.00E-09 1.34E-09 1.48E-09 1.79E-09 6.27E-09 3.74E-09 5.08E-09 6.27E-09 7.11E-09 -1.87E-09 -1.74E-09 -2.28E-09 -1.87E-09 -2.71E-09 1.40E-09 2.20E-09 1.80E-09 2.60E-09 3.20E-09 1.34E-09 1.79E-09 4.47E-10 1.52E-09 8.37E-10 5.08E-09 7.11E-09 3.03E-09 6.76E-09 5.49E-09 -2.28E-09 -2.71E-09 5.74E-10 -1.56E-09 9.06E-10 2.00E-06 2.00E-06 2.00E-06 2.00E-06 2.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Average Biased Average Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MAX 2.50E-06 Output Leakage Current 2 (A) 2.00E-06 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 -2.50E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.22. Plot of output leakage current (comparator 2) versus total dose. The data show no significant degradation with total dose. The solid diamonds are the average of measured data points from the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 49 200 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.22. Raw data for the output leakage current (comparator 2) versus total dose, including the statistical analysis, the specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Leakage Current 2 (A) Device 694 695 698 699 700 701 702 704 705 706 1280 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 20 50 100 200 0.00E+00 3.00E-09 2.00E-09 2.00E-09 0.00E+00 1.00E-09 2.00E-09 3.00E-09 2.00E-09 2.00E-09 1.00E-09 0.00E+00 0.00E+00 0.00E+00 2.00E-09 0.00E+00 2.00E-09 2.00E-09 0.00E+00 2.00E-09 1.00E-09 0.00E+00 3.00E-09 2.00E-09 2.00E-09 1.00E-09 2.00E-09 2.00E-09 0.00E+00 1.00E-09 3.00E-09 1.00E-09 1.00E-09 3.00E-09 3.00E-09 1.00E-09 2.00E-09 1.00E-09 4.00E-09 4.00E-09 3.00E-09 2.00E-09 1.00E-09 2.00E-09 2.00E-09 0.00E+00 1.00E-09 0.00E+00 1.00E-09 1.00E-09 0.00E+00 0.00E+00 2.00E-09 2.00E-09 0.00E+00 6.00E-10 1.40E-09 2.00E-09 1.20E-09 1.60E-09 5.48E-10 1.34E-09 1.22E-09 1.10E-09 8.94E-10 2.10E-09 5.08E-09 5.36E-09 4.20E-09 4.05E-09 -9.02E-10 -2.28E-09 -1.36E-09 -1.80E-09 -8.53E-10 1.60E-09 1.60E-09 1.00E-09 2.00E-09 2.20E-09 1.34E-09 5.48E-10 7.07E-10 1.58E-09 1.30E-09 5.28E-09 3.10E-09 2.94E-09 6.34E-09 5.78E-09 -2.08E-09 9.81E-11 -9.39E-10 -2.34E-09 -1.38E-09 2.00E-06 2.00E-06 2.00E-06 2.00E-06 2.00E-06 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 50 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary were presented in this report. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 90/90 and a 5-piece sample size. Note that the following criteria was used to determine the outcome of the testing: following the radiation exposure each parameter had to pass the specification value and the average value for the five-piece sample must pass the specification value when the KTL limits are applied. If these conditions were not both satisfied following the radiation exposure, then the lot could be logged as an RLAT failure. The units passed the radiation lot acceptance test with only minor degradation to the input offset and input bias current parameters and no significant degradation to any other measured parameter. An ISO 9001:2000 Certified Company 51 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: TID Bias Connections Biased Samples: Pin Function Connection / Bias 1 OUT1 +15V Via 10kΩ 2 GND1 GND 3 +IN1 To Pin 8 and –15V via 10kΩ 4 -IN1 To Pin 9 and +15V via 10kΩ and Pin 8 via 100Ω 5 V- -15V 6 OUT2 +15V Via 10kΩ 7 GND2 GND 8 +IN2 To Pin 3 and –15V via 10kΩ and Pin 4 via 100Ω 9 -IN2 To Pin 4 and +15V via 10kΩ 10 V+ +15V Unbiased Samples: Pin Function Connection / Bias 1 OUT1 2 GND1 GND GND 3 +IN1 GND 4 -IN1 GND 5 V- GND 6 OUT2 GND 7 GND2 GND 8 +IN2 GND 9 -IN2 GND 10 V+ GND An ISO 9001:2000 Certified Company 52 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure A.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION, RH119 Datasheet. Figure A.2. Package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY CORPORATION, RH119 Datasheet. An ISO 9001:2000 Certified Company 53 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: Photograph of device-under-test to show part markings An ISO 9001:2000 Certified Company 54 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions (All Subgroup 1 Parameters) All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including dual comparators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1 A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020 for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. An ISO 9001:2000 Certified Company 55 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report R1.1 081220 Table C.1. Measured parameters and test conditions for the RH119W. TEST DESCRIPTION TEST CONDITIONS Input Offset Voltage, VOS1, VOS2 VS = ±15V, VCM = 0V Common Mode Rejection Ratio, CMRR1, CMRR2 VS = ±15V Input Offset Current, IOS1, IOS2 VS = ±15V, VCM = 0V Input Bias Current, Non-Inverting Input, +IB1, +IB2 VS = ±15V, VCM = 0V Input Bias Current, Inverting Input, -IB1, -IB2 VS = ±15V, VCM = 0V Large Signal Voltage Gain, AVOL1, AVOL2 VS = ±15V, VCM = 0V Saturation Voltage, VSAT1, VSAT2 +VS = +4.5V, -VS=0V, ISINK = 3.2mA Saturation Voltage, VSAT3, VSAT4 VS = ±15V, IOUT = 25mA Output Leakage Current, ICEX1, ICEX2 VIN=5mV, VOUT to V– = 35V Positive Supply Current, +IS VS = ±15V Negative Supply Current, -IS VS = ±15V An ISO 9001:2000 Certified Company 56 RLAT Report R1.1 081220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution for the RH119W. The resolution is based either on test data or the LSB of the DAC for a given measurement. Measured Parameter Pre-Irradiation Specification Measurement Resolution/Precision 4mV MAX ±3.38E-05V 90dB MIN ±9.70E+00dB 75nA MAX ±9.24E-09A Input Offset Voltage, VOS1, VOS2 Common Mode Rejection Ratio, CMRR1, CMRR2 Input Offset Current, IOS1, IOS2 Input Bias Current, Non-Inverting Input, +IB1, +IB2 Input Bias Current, Inverting Input, -IB1, -IB2 500nA MAX ±1.00E-08A 500nA MAX ±1.00E-08A Large Signal Voltage Gain, AVOL1, AVOL2 10V/mV MIN ±2.06E+01V/mV Large Signal Voltage Gain, AVOL1, AVOL2 80dB MIN ±2.29E+00dB Saturation Voltage, VSAT1, VSAT2 0.4V MAX ±1.00E-03V Saturation Voltage, VSAT3, VSAT4 1.5V MAX ±5.00E-03V Output Leakage Current, ICEX1, ICEX2 2µA MAX ±3.24E-09A Positive Supply Current, +IS 11.5mA MAX ±6.54E-05 A Negative Supply Current, -IS 4.5mA MAX ±9.97E-06A An ISO 9001:2000 Certified Company 57