ELDRS_LDR_RH119W_Fab_Lot_F0258.1_W13.pdf

ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
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ELDRS Report
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Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH119W High Performance Dual Comparator for Linear Technology
Customer: Linear Technology, PO# 73783L
RAD Job Number: 15-0663
Part Type Tested: RH119W High Performance Dual Comparator, Linear Technology RH119
Datasheet I.D No. 66-10-0176 Revision C
Traceability Information: Fab Lot Number: F0258.1, Lot Number: 601387.1, Wafer Number: 13, Date
Code: 1049A. See photograph of unit under test in Appendix A.
Quantity of Units: 11 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 1
unit for control. Serial numbers 1802, 1803, 1804, 1805 and 1806 were biased during irradiation, serial
numbers 1807, 1808, 1809, 1841 and 1842 were unbiased during irradiation and serial number 1850 was
used as control. See Appendix B for the radiation bias connection table.
Radiation and Electrical Test Increments: 10mrad(Si)/s ionizing radiation with electrical test
increments: pre-irradiation, 10krad(Si), 20krad(Si), 30krad(Si), 50krad(Si) and 100krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD
Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a
168-hour 100°C anneal. Both anneals were performed in the same electrical bias condition as the
irradiations. Electrical measurements were made following each anneal increment.
Radiation Test Standard: MIL-STD-750 TM1019 and/or MIL-STD-883 TM1019 Condition D and
Linear Technology RH119 Datasheet I.D No. 66-10-0176 Revision C.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS04, Calibration Date:
5/28/2015, Calibration Due: 5/28/2016. LTS2101 Family Board, Entity ID FB10. LTS0608 Test Fixture,
Entity ID TF08. RH119 DUT Board. Test Program: RH119AX.SRC
Facility and Radiation Source: Aeroflex RAD's, Colorado Springs, CO. Gamma rays provided by
Co60 (GB-150) low dose rate source. Dosimetry performed by Air Ionization Chamber (AIC) traceable
to NIST. Aeroflex RAD's dosimetry has been audited by DLA and Aeroflex RAD has been awarded
Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and
MIL-STD-750.
Low Dose Rate Test Result: PASSED the enhanced low dose rate sensitivity
test to the maximum tested dose level of 100krad(Si) with all parameters
remaining within their datasheet specifications. Further the units do not exhibit
ELDRS as defined in the current test method.
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6µm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as "birds-beak" oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a "conventional" room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883H TM 1019). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883H TM 1019 requires that devices that could
potentially exhibit ELDRS "shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin". While the recently released MIL-STD883H TM 1019 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883H TM1019 Condition D, we have performed a low dose rate test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The low dose rate testing described in this final report was performed using the facilities at Aeroflex
RAD's Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s, determined by the distance
from the source. For low dose rate testing described in this report, the devices are placed approximately
2-meters from the Co-60 rods. The irradiator calibration is maintained by Aeroflex RAD's Longmire
Laboratories using air ionization chamber (AIC) dosimetry traceable to the National Institute of
Standards and Technology (NIST). Figure 2.1 shows a photograph of the GB-150 Co-60 irradiator at
Aeroflex RAD's Longmire Laboratory facility.
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Figure 2.1. Aeroflex RAD's Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a
fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 50rad(Si)/s close
to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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3.0. Radiation Test Conditions
The RH119W High Performance Dual Comparator described in this final report were irradiated using a
single-sided supply potential of +/-15V and with all pins tied to ground, that is biased and unbiased. See
Appendix B for details on the biasing conditions during radiation exposure. In our opinion, this bias
circuit satisfies the requirements of MIL-STD-883H TM1019 Section 3.9.3 Bias and Loading
Conditions which states "The bias applied to the test devices shall be selected to produce the greatest
radiation induced damage or the worst-case damage for the intended application, if known. While
maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or
maximum output load current) exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 100krad(Si) with incremental
readings at 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si). Electrical testing occurred within one
hour following the end of each irradiation segment. For intermediate irradiations, the units were tested
and returned to total dose exposure within two hours from the end of the previous radiation increment.
The radiation exposure bias board was positioned in the Co-60 cell to provide the targeted dose rate
of10mrad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is
required under MIL-STD-883H TM1019 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al)
container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects
caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at
least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium
for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al
container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the
source, container, or test-fixture is changed. This measurement shall be performed by placing a
dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it
can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry
errors due to dose enhancement, the Pb/Al container may be omitted".
The final dose rate within the lead-aluminum box was determined based on air ionization chamber
(AIC) dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose
rate for this work was 10mrad(Si)/s with a precision of ±5%.
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4.0. Tested Parameters
During the enhanced low dose rate sensitivity testing the following electrical parameters were measured
pre- and post-irradiation:
1. Positive Supply Current (A) @ VS=+/-15V, VCM=0V
2. Negative Supply Current (A) @ VS=+/-15V, VCM=0V
3. Offset Voltage (V) @ VS=+/-15V, VCM=0V
4. Input Offset Current (A) @ VS=+/-15V, VCM=0V
5. Positive Input Bias Current (A) @ VS=+/-15V, VCM=0V
6. Negative Input Bias Current (A) @ VS=+/-15V, VCM=0V
7. Large Signal Voltage Gain (V/mV) @ VS=+/-15V, VCM=0V
8. Common Mode Rejection Ratio (dB) @ VS=+/-15V, VCM=+/-10V
9. Saturation Voltage1 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
10. Saturation Voltage2 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA
11. Output Leakage Current (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
Further, MIL-STD-883H, TM 1019 Section 3.13.1.1 Characterization test to determine if a part exhibits
ELDRS' states the following: Select a minimum random sample of 21 devices from a population
representative of recent production runs. Smaller sample sizes may be used if agreed upon between the
parties to the test. All of the selected devices shall have undergone appropriate elevated temperature
reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of
5 each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all
parts assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and
another 5 under the irradiation bias given in the acquisition specification at 50-300 rad(Si)/s and room
temperature. Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the
acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose
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levels, including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical
characterization on each part at each dose level. Post irradiation electrical measurements shall be
performed per paragraph 3.10 where the low dose rate test is considered Condition D. Calculate the
radiation induced change in each electrical parameter (Δpara) for each sample at each radiation level.
Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each
irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive
parameters then the part is considered to be ELDRS susceptible. This test does not apply to parameters
which exhibit changes that are within experimental error or whose values are below the pre-irradiation
electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled "Total
Ionizing Dose (TID) Radiation Testing of the RH119W High Performance Dual Comparator for Linear
Technology" to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
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5.0. ELDRS Test Results
Based on this criterion the RH119W High Performance Dual Comparator (from the lot traceability
information provided on the first page of this test report) PASSED the enhanced low dose rate
sensitivity test to the maximum tested dose level of 100krad(Si) with all parameters remaining within
their datasheet specifications.
Figures 5.1 through 5.20 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.20 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the sample irradiated in the biased condition while the shaded lines
(solid or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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Figure 5.1. Plot of Positive Supply Current (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
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Table 5.1. Raw data for Positive Supply Current (A) @ VS=+/-15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Supply Current (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
100
7.55E-03
7.21E-03
7.29E-03
7.71E-03
7.47E-03
7.62E-03
7.50E-03
7.44E-03
7.32E-03
7.36E-03
7.38E-03
24-hr
Anneal
110
7.56E-03
7.21E-03
7.28E-03
7.73E-03
7.48E-03
7.62E-03
7.50E-03
7.46E-03
7.31E-03
7.36E-03
7.36E-03
168-hr
Anneal
120
7.54E-03
7.24E-03
7.31E-03
7.73E-03
7.48E-03
7.64E-03
7.51E-03
7.46E-03
7.31E-03
7.37E-03
7.37E-03
0
7.58E-03
7.26E-03
7.32E-03
7.76E-03
7.50E-03
7.63E-03
7.52E-03
7.47E-03
7.35E-03
7.39E-03
7.38E-03
10
7.56E-03
7.23E-03
7.30E-03
7.74E-03
7.49E-03
7.63E-03
7.51E-03
7.47E-03
7.34E-03
7.39E-03
7.38E-03
Total Dose (krad(Si))
20
30
7.53E-03 7.51E-03
7.19E-03 7.19E-03
7.27E-03 7.26E-03
7.71E-03 7.70E-03
7.46E-03 7.45E-03
7.61E-03 7.62E-03
7.50E-03 7.50E-03
7.46E-03 7.45E-03
7.34E-03 7.33E-03
7.38E-03 7.38E-03
7.37E-03 7.38E-03
7.48E-03
2.01E-04
8.04E-03
6.93E-03
7.46E-03
2.05E-04
8.03E-03
6.90E-03
7.43E-03
2.07E-04
8.00E-03
6.86E-03
7.42E-03
2.04E-04
7.98E-03
6.86E-03
7.43E-03
2.02E-04
7.98E-03
6.87E-03
7.45E-03
2.00E-04
7.99E-03
6.90E-03
7.45E-03
2.09E-04
8.02E-03
6.88E-03
7.46E-03
1.95E-04
8.00E-03
6.92E-03
7.47E-03
1.13E-04
7.78E-03
7.16E-03
1.15E-02
PASS
7.47E-03
1.15E-04
7.78E-03
7.15E-03
1.15E-02
PASS
7.46E-03
1.07E-04
7.75E-03
7.17E-03
1.15E-02
PASS
7.45E-03
1.12E-04
7.76E-03
7.15E-03
1.15E-02
PASS
7.45E-03
1.16E-04
7.77E-03
7.13E-03
1.15E-02
PASS
7.45E-03
1.17E-04
7.77E-03
7.13E-03
1.15E-02
PASS
7.45E-03
1.20E-04
7.78E-03
7.12E-03
1.15E-02
PASS
7.46E-03
1.27E-04
7.81E-03
7.11E-03
1.15E-02
PASS
50
7.53E-03
7.20E-03
7.27E-03
7.71E-03
7.45E-03
7.61E-03
7.50E-03
7.45E-03
7.32E-03
7.37E-03
7.37E-03
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Figure 5.2. Plot of Negative Supply Current (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
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Table 5.2. Raw data for Negative Supply Current (A) @ VS=+/-15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Negative Supply Current (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
100
-3.27E-03
-3.14E-03
-3.16E-03
-3.36E-03
-3.25E-03
-3.35E-03
-3.27E-03
-3.25E-03
-3.20E-03
-3.21E-03
-3.21E-03
24-hr
Anneal
110
-3.27E-03
-3.14E-03
-3.16E-03
-3.36E-03
-3.25E-03
-3.35E-03
-3.27E-03
-3.26E-03
-3.20E-03
-3.21E-03
-3.21E-03
168-hr
Anneal
120
-3.28E-03
-3.14E-03
-3.17E-03
-3.36E-03
-3.25E-03
-3.35E-03
-3.27E-03
-3.25E-03
-3.19E-03
-3.21E-03
-3.21E-03
0
-3.29E-03
-3.16E-03
-3.18E-03
-3.37E-03
-3.26E-03
-3.36E-03
-3.27E-03
-3.26E-03
-3.20E-03
-3.21E-03
-3.21E-03
10
-3.28E-03
-3.15E-03
-3.18E-03
-3.37E-03
-3.26E-03
-3.35E-03
-3.27E-03
-3.25E-03
-3.20E-03
-3.21E-03
-3.21E-03
Total Dose (krad(Si))
20
30
-3.28E-03 -3.28E-03
-3.14E-03 -3.14E-03
-3.17E-03 -3.17E-03
-3.36E-03 -3.36E-03
-3.25E-03 -3.25E-03
-3.35E-03 -3.35E-03
-3.27E-03 -3.27E-03
-3.26E-03 -3.25E-03
-3.20E-03 -3.20E-03
-3.21E-03 -3.21E-03
-3.21E-03 -3.21E-03
-3.25E-03
8.70E-05
-3.01E-03
-3.49E-03
-3.25E-03
8.89E-05
-3.00E-03
-3.49E-03
-3.24E-03
8.86E-05
-3.00E-03
-3.48E-03
-3.24E-03
8.96E-05
-2.99E-03
-3.49E-03
-3.24E-03
8.84E-05
-3.00E-03
-3.48E-03
-3.24E-03
8.81E-05
-2.99E-03
-3.48E-03
-3.24E-03
8.87E-05
-2.99E-03
-3.48E-03
-3.24E-03
8.75E-05
-3.00E-03
-3.48E-03
-3.26E-03
6.30E-05
-3.08E-03
-3.43E-03
-4.50E-03
PASS
-3.26E-03
6.19E-05
-3.09E-03
-3.43E-03
-4.50E-03
PASS
-3.26E-03
6.16E-05
-3.09E-03
-3.43E-03
-4.50E-03
PASS
-3.26E-03
6.20E-05
-3.09E-03
-3.43E-03
-4.50E-03
PASS
-3.26E-03
6.23E-05
-3.08E-03
-3.43E-03
-4.50E-03
PASS
-3.26E-03
6.13E-05
-3.09E-03
-3.42E-03
-4.50E-03
PASS
-3.26E-03
6.21E-05
-3.08E-03
-3.43E-03
-4.50E-03
PASS
-3.25E-03
6.30E-05
-3.08E-03
-3.43E-03
-4.50E-03
PASS
50
-3.28E-03
-3.14E-03
-3.17E-03
-3.36E-03
-3.25E-03
-3.35E-03
-3.27E-03
-3.25E-03
-3.20E-03
-3.21E-03
-3.21E-03
An ISO 9001:2008 and DLA Certified Company
12
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.3. Plot of Offset Voltage_1 (V) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
13
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for Offset Voltage_1 (V) @ VS=+/-15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Offset Voltage_1 (V)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
0
2.74E-04
1.92E-04
2.11E-04
2.03E-04
6.30E-05
-1.50E-05
-7.00E-05
-1.12E-04
3.39E-04
1.98E-04
3.67E-04
Biased Statistics
Average Biased
1.89E-04
Std Dev Biased
7.71E-05
Ps90%/90% (+KTL) Biased
4.00E-04
Ps90%/90% (-KTL) Biased
-2.29E-05
Un-Biased Statistics
Average Un-Biased
6.80E-05
Std Dev Un-Biased
1.93E-04
Ps90%/90% (+KTL) Un-Biased 5.97E-04
Ps90%/90% (-KTL) Un-Biased -4.61E-04
Specification MIN
-4.00E-03
Status
PASS
Specification MAX
4.00E-03
Status
PASS
100
3.03E-04
2.03E-04
2.37E-04
2.12E-04
9.20E-05
-5.30E-05
-1.02E-04
-1.50E-04
3.05E-04
1.67E-04
3.66E-04
24-hr
Anneal
110
3.03E-04
2.03E-04
2.40E-04
2.11E-04
9.20E-05
-5.40E-05
-1.04E-04
-1.51E-04
3.00E-04
1.65E-04
3.67E-04
168-hr
Anneal
120
2.85E-04
1.81E-04
2.12E-04
1.88E-04
7.70E-05
-4.40E-05
-9.90E-05
-1.53E-04
3.04E-04
1.74E-04
3.68E-04
2.09E-04
7.70E-05
4.20E-04
-2.27E-06
2.09E-04
7.64E-05
4.19E-04
-1.13E-07
2.10E-04
7.67E-05
4.20E-04
-4.72E-07
1.89E-04
7.48E-05
3.94E-04
-1.64E-05
4.72E-05
1.91E-04
5.72E-04
-4.78E-04
-4.00E-03
PASS
4.00E-03
PASS
3.34E-05
1.94E-04
5.66E-04
-4.99E-04
-4.00E-03
PASS
4.00E-03
PASS
3.12E-05
1.93E-04
5.60E-04
-4.98E-04
-4.00E-03
PASS
4.00E-03
PASS
3.64E-05
1.94E-04
5.70E-04
-4.97E-04
-4.00E-03
PASS
4.00E-03
PASS
10
2.92E-04
1.98E-04
2.28E-04
2.09E-04
8.00E-05
-1.90E-05
-7.00E-05
-1.17E-04
3.33E-04
1.92E-04
3.65E-04
Total Dose (krad(Si))
20
30
3.03E-04 3.04E-04
2.02E-04 2.06E-04
2.34E-04 2.36E-04
2.14E-04 2.15E-04
8.50E-05 8.50E-05
-2.50E-05 -3.00E-05
-7.60E-05 -8.10E-05
-1.22E-04 -1.27E-04
3.27E-04 3.22E-04
1.88E-04 1.84E-04
3.67E-04 3.66E-04
50
3.01E-04
2.04E-04
2.38E-04
2.13E-04
8.90E-05
-3.40E-05
-8.70E-05
-1.35E-04
3.16E-04
1.76E-04
3.64E-04
2.01E-04
7.70E-05
4.13E-04
-9.77E-06
2.08E-04
7.89E-05
4.24E-04
-8.75E-06
2.09E-04
7.93E-05
4.27E-04
-8.33E-06
6.38E-05
1.91E-04
5.88E-04
-4.61E-04
-4.00E-03
PASS
4.00E-03
PASS
5.84E-05
1.91E-04
5.83E-04
-4.66E-04
-4.00E-03
PASS
4.00E-03
PASS
5.36E-05
1.92E-04
5.79E-04
-4.72E-04
-4.00E-03
PASS
4.00E-03
PASS
An ISO 9001:2008 and DLA Certified Company
14
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.4. Plot of Offset Voltage_2 (V) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
15
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for Offset Voltage_2 (V) @ VS=+/-15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Offset Voltage_2 (V)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
0
-1.67E-04
1.05E-04
3.98E-04
1.39E-04
5.67E-04
-2.80E-05
-1.60E-05
4.40E-05
3.51E-04
-1.67E-04
1.59E-04
Biased Statistics
Average Biased
2.08E-04
Std Dev Biased
2.83E-04
Ps90%/90% (+KTL) Biased
9.85E-04
Ps90%/90% (-KTL) Biased
-5.68E-04
Un-Biased Statistics
Average Un-Biased
3.68E-05
Std Dev Un-Biased
1.92E-04
Ps90%/90% (+KTL) Un-Biased 5.63E-04
Ps90%/90% (-KTL) Un-Biased -4.89E-04
Specification MIN
-4.00E-03
Status
PASS
Specification MAX
4.00E-03
Status
PASS
100
-1.07E-04
1.47E-04
4.61E-04
1.83E-04
6.19E-04
-6.00E-05
-5.10E-05
1.10E-05
3.20E-04
-1.94E-04
1.59E-04
24-hr
Anneal
110
-1.07E-04
1.46E-04
4.58E-04
1.80E-04
6.19E-04
-6.40E-05
-5.40E-05
6.00E-06
3.20E-04
-1.95E-04
1.58E-04
168-hr
Anneal
120
-1.31E-04
1.23E-04
4.25E-04
1.69E-04
6.01E-04
-5.50E-05
-4.50E-05
1.80E-05
3.20E-04
-1.94E-04
1.56E-04
2.52E-04
2.88E-04
1.04E-03
-5.38E-04
2.61E-04
2.84E-04
1.04E-03
-5.18E-04
2.59E-04
2.84E-04
1.04E-03
-5.19E-04
2.37E-04
2.83E-04
1.01E-03
-5.39E-04
1.82E-05
1.92E-04
5.46E-04
-5.09E-04
-4.00E-03
PASS
4.00E-03
PASS
5.20E-06
1.91E-04
5.29E-04
-5.19E-04
-4.00E-03
PASS
4.00E-03
PASS
2.60E-06
1.92E-04
5.29E-04
-5.24E-04
-4.00E-03
PASS
4.00E-03
PASS
8.80E-06
1.90E-04
5.31E-04
-5.13E-04
-4.00E-03
PASS
4.00E-03
PASS
10
-1.40E-04
1.27E-04
4.29E-04
1.59E-04
5.93E-04
-3.20E-05
-2.10E-05
4.40E-05
3.50E-04
-1.68E-04
1.58E-04
Total Dose (krad(Si))
20
30
-1.32E-04 -1.26E-04
1.35E-04 1.37E-04
4.44E-04 4.48E-04
1.69E-04 1.70E-04
6.05E-04 6.09E-04
-3.70E-05 -4.10E-05
-2.50E-05 -3.10E-05
3.80E-05 3.30E-05
3.45E-04 3.40E-04
-1.72E-04 -1.75E-04
1.57E-04 1.58E-04
50
-1.24E-04
1.40E-04
4.53E-04
1.76E-04
6.15E-04
-4.60E-05
-3.60E-05
2.40E-05
3.34E-04
-1.85E-04
1.58E-04
2.34E-04
2.85E-04
1.01E-03
-5.47E-04
2.44E-04
2.87E-04
1.03E-03
-5.42E-04
2.48E-04
2.87E-04
1.03E-03
-5.38E-04
3.46E-05
1.92E-04
5.62E-04
-4.93E-04
-4.00E-03
PASS
4.00E-03
PASS
2.98E-05
1.92E-04
5.57E-04
-4.97E-04
-4.00E-03
PASS
4.00E-03
PASS
2.52E-05
1.92E-04
5.50E-04
-5.00E-04
-4.00E-03
PASS
4.00E-03
PASS
An ISO 9001:2008 and DLA Certified Company
16
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.5. Plot of Input Offset Current_1 (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
17
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for Input Offset Current_1 (A) @ VS=+/-15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current_1 (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
100
-3.51E-08
-3.44E-08
-3.64E-08
-3.23E-08
-2.73E-08
-3.53E-09
1.34E-08
7.27E-09
-8.30E-10
-1.57E-09
-8.58E-09
24-hr
Anneal
110
-3.51E-08
-3.48E-08
-3.60E-08
-3.24E-08
-2.73E-08
-1.20E-09
1.49E-08
9.20E-09
1.52E-09
-3.00E-10
-8.44E-09
168-hr
Anneal
120
-2.10E-08
-1.70E-08
-1.99E-08
-1.81E-08
-1.48E-08
-1.00E-11
8.03E-09
5.83E-09
-1.85E-09
-1.21E-09
-8.70E-09
0
-7.11E-09
-2.34E-09
-5.08E-09
-2.69E-09
-2.55E-09
-3.14E-09
1.04E-09
-1.63E-09
-7.32E-09
-3.79E-09
-8.58E-09
10
-1.44E-08
-1.26E-08
-1.27E-08
-1.19E-08
-1.07E-08
-1.45E-09
3.07E-09
-3.10E-10
-4.80E-09
-2.91E-09
-8.59E-09
Total Dose (krad(Si))
20
30
-1.86E-08 -2.17E-08
-1.47E-08 -1.81E-08
-1.76E-08 -2.02E-08
-1.66E-08 -1.90E-08
-1.49E-08 -1.65E-08
-1.53E-09 -2.24E-09
4.78E-09 5.48E-09
1.48E-09 2.56E-09
-3.11E-09 -2.92E-09
-1.99E-09 -2.29E-09
-8.51E-09 -8.80E-09
-3.95E-09
2.09E-09
1.77E-09
-9.67E-09
-1.25E-08
1.38E-09
-8.71E-09
-1.63E-08
-1.65E-08
1.69E-09
-1.19E-08
-2.11E-08
-1.91E-08
2.00E-09
-1.36E-08
-2.46E-08
-2.29E-08
1.81E-09
-1.79E-08
-2.78E-08
-3.31E-08
3.57E-09
-2.33E-08
-4.29E-08
-3.31E-08
3.49E-09
-2.35E-08
-4.27E-08
-1.81E-08
2.45E-09
-1.14E-08
-2.49E-08
-2.97E-09
3.06E-09
5.43E-09
-1.14E-08
-7.50E-08
PASS
7.50E-08
PASS
-1.28E-09
2.96E-09
6.82E-09
-9.38E-09
-7.50E-08
PASS
7.50E-08
PASS
-7.40E-11
3.20E-09
8.70E-09
-8.85E-09
-1.00E-07
PASS
1.00E-07
PASS
1.18E-10
3.72E-09
1.03E-08
-1.01E-08
-1.00E-07
PASS
1.00E-07
PASS
6.74E-10
4.36E-09
1.26E-08
-1.13E-08
-1.50E-07
PASS
1.50E-07
PASS
2.96E-09
7.17E-09
2.26E-08
-1.67E-08
-3.00E-07
PASS
3.00E-07
PASS
4.82E-09
6.96E-09
2.39E-08
-1.43E-08
-3.00E-07
PASS
3.00E-07
PASS
2.16E-09
4.47E-09
1.44E-08
-1.01E-08
-3.00E-07
PASS
3.00E-07
PASS
50
-2.33E-08
-2.19E-08
-2.51E-08
-2.37E-08
-2.03E-08
-1.57E-09
7.70E-09
2.10E-09
-1.97E-09
-2.89E-09
-8.66E-09
An ISO 9001:2008 and DLA Certified Company
18
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.6. Plot of Input Offset Current_2 (A) @ VS=+/-15V, VCM=0V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
19
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for Input Offset Current_2 (A) @ VS=+/-15V, VCM=0V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Input Offset Current_2 (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
100
-3.40E-08
-5.38E-08
-4.84E-08
-3.38E-08
-4.27E-08
-6.94E-09
-1.44E-08
-1.45E-08
-1.60E-08
-9.21E-09
-3.56E-09
24-hr
Anneal
110
-3.38E-08
-5.40E-08
-4.85E-08
-3.37E-08
-4.23E-08
-3.42E-09
-1.01E-08
-1.21E-08
-1.43E-08
-7.18E-09
-3.62E-09
168-hr
Anneal
120
-1.46E-08
-2.48E-08
-2.32E-08
-1.58E-08
-2.44E-08
3.42E-09
6.50E-10
-1.16E-09
-3.79E-09
2.41E-09
-3.61E-09
0
-2.34E-09
-1.17E-08
-8.05E-09
-3.72E-09
-8.81E-09
5.10E-10
4.60E-10
-1.49E-09
-4.96E-09
-5.40E-10
-2.62E-09
10
-1.26E-08
-2.25E-08
-1.82E-08
-1.34E-08
-2.11E-08
1.27E-09
-2.30E-10
-1.25E-09
-3.89E-09
1.06E-09
-2.33E-09
Total Dose (krad(Si))
20
30
-1.76E-08 -1.96E-08
-2.94E-08 -3.41E-08
-2.46E-08 -2.82E-08
-1.91E-08 -2.12E-08
-2.76E-08 -2.93E-08
3.30E-10 -4.30E-10
-1.13E-09 -1.70E-09
-3.55E-09 -4.50E-09
-5.99E-09 -5.80E-09
1.20E-10 -1.00E-09
-3.48E-09 -3.60E-09
-6.92E-09
3.84E-09
3.60E-09
-1.74E-08
-1.76E-08
4.46E-09
-5.32E-09
-2.98E-08
-2.37E-08
5.15E-09
-9.55E-09
-3.78E-08
-2.64E-08
6.01E-09
-9.95E-09
-4.29E-08
-3.13E-08
7.22E-09
-1.15E-08
-5.10E-08
-4.25E-08
8.83E-09
-1.83E-08
-6.67E-08
-4.25E-08
8.96E-09
-1.79E-08
-6.70E-08
-2.05E-08
4.94E-09
-7.01E-09
-3.41E-08
-1.20E-09
2.25E-09
4.98E-09
-7.39E-09
-7.50E-08
PASS
7.50E-08
PASS
-6.08E-10
2.10E-09
5.15E-09
-6.37E-09
-7.50E-08
PASS
7.50E-08
PASS
-2.04E-09
2.69E-09
5.34E-09
-9.43E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.69E-09
2.34E-09
3.73E-09
-9.10E-09
-1.00E-07
PASS
1.00E-07
PASS
-6.29E-09
3.74E-09
3.95E-09
-1.65E-08
-1.50E-07
PASS
1.50E-07
PASS
-1.22E-08
3.91E-09
-1.48E-09
-2.29E-08
-3.00E-07
PASS
3.00E-07
PASS
-9.44E-09
4.27E-09
2.26E-09
-2.11E-08
-3.00E-07
PASS
3.00E-07
PASS
3.06E-10
2.88E-09
8.20E-09
-7.59E-09
-3.00E-07
PASS
3.00E-07
PASS
50
-2.21E-08
-3.90E-08
-3.48E-08
-2.52E-08
-3.51E-08
-1.24E-09
-4.08E-09
-9.33E-09
-1.03E-08
-6.51E-09
-3.63E-09
An ISO 9001:2008 and DLA Certified Company
20
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.7. Plot of Positive Input Bias Current_1 (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
21
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for Positive Input Bias Current_1 (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current_1 (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
100
-4.43E-07
-4.78E-07
-4.66E-07
-4.58E-07
-4.28E-07
-5.37E-07
-5.41E-07
-5.59E-07
-5.19E-07
-4.76E-07
-3.21E-07
24-hr
Anneal
110
-4.43E-07
-4.78E-07
-4.64E-07
-4.59E-07
-4.28E-07
-5.31E-07
-5.35E-07
-5.55E-07
-5.13E-07
-4.72E-07
-3.20E-07
168-hr
Anneal
120
-3.82E-07
-4.07E-07
-3.99E-07
-4.03E-07
-3.77E-07
-4.23E-07
-4.33E-07
-4.40E-07
-4.10E-07
-3.88E-07
-3.21E-07
0
-3.12E-07
-3.33E-07
-3.29E-07
-3.40E-07
-3.15E-07
-3.40E-07
-3.50E-07
-3.55E-07
-3.29E-07
-3.19E-07
-3.22E-07
10
-3.44E-07
-3.62E-07
-3.60E-07
-3.67E-07
-3.47E-07
-3.65E-07
-3.75E-07
-3.81E-07
-3.54E-07
-3.44E-07
-3.21E-07
Total Dose (krad(Si))
20
30
-3.67E-07 -3.79E-07
-3.88E-07 -4.05E-07
-3.83E-07 -3.96E-07
-3.87E-07 -3.97E-07
-3.71E-07 -3.78E-07
-3.87E-07 -4.09E-07
-3.95E-07 -4.15E-07
-4.02E-07 -4.22E-07
-3.76E-07 -3.94E-07
-3.66E-07 -3.79E-07
-3.21E-07 -3.22E-07
-3.26E-07
1.20E-08
-2.93E-07
-3.59E-07
-3.56E-07
1.01E-08
-3.28E-07
-3.84E-07
-3.79E-07
9.73E-09
-3.52E-07
-4.06E-07
-3.91E-07
1.19E-08
-3.58E-07
-4.24E-07
-4.10E-07
1.48E-08
-3.69E-07
-4.51E-07
-4.54E-07
1.94E-08
-4.01E-07
-5.08E-07
-4.54E-07
1.93E-08
-4.01E-07
-5.07E-07
-3.93E-07
1.34E-08
-3.57E-07
-4.30E-07
-3.39E-07
1.50E-08
-2.97E-07
-3.80E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.64E-07
1.48E-08
-3.23E-07
-4.04E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.85E-07
1.46E-08
-3.45E-07
-4.25E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.04E-07
1.73E-08
-3.56E-07
-4.51E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.41E-07
1.68E-08
-3.95E-07
-4.87E-07
-1.00E-06
PASS
1.00E-06
PASS
-5.26E-07
3.16E-08
-4.40E-07
-6.13E-07
-1.50E-06
PASS
1.50E-06
PASS
-5.21E-07
3.12E-08
-4.36E-07
-6.07E-07
-1.50E-06
PASS
1.50E-06
PASS
-4.19E-07
2.06E-08
-3.62E-07
-4.75E-07
-1.50E-06
PASS
1.50E-06
PASS
50
-3.88E-07
-4.23E-07
-4.19E-07
-4.18E-07
-4.02E-07
-4.28E-07
-4.45E-07
-4.68E-07
-4.38E-07
-4.27E-07
-3.20E-07
An ISO 9001:2008 and DLA Certified Company
22
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.8. Plot of Positive Input Bias Current_2 (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
23
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for Positive Input Bias Current_2 (A) @ VS=+/-15V, VCM=0V versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Positive Input Bias Current_2 (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
100
-4.60E-07
-5.06E-07
-4.91E-07
-4.75E-07
-4.52E-07
-5.70E-07
-5.78E-07
-5.97E-07
-5.42E-07
-4.97E-07
-3.18E-07
24-hr
Anneal
110
-4.61E-07
-5.06E-07
-4.90E-07
-4.76E-07
-4.52E-07
-5.62E-07
-5.70E-07
-5.91E-07
-5.36E-07
-4.93E-07
-3.17E-07
168-hr
Anneal
120
-3.88E-07
-4.21E-07
-4.11E-07
-4.12E-07
-3.92E-07
-4.39E-07
-4.47E-07
-4.58E-07
-4.17E-07
-3.96E-07
-3.18E-07
0
-3.10E-07
-3.32E-07
-3.29E-07
-3.36E-07
-3.19E-07
-3.38E-07
-3.50E-07
-3.56E-07
-3.28E-07
-3.16E-07
-3.19E-07
10
-3.48E-07
-3.71E-07
-3.67E-07
-3.71E-07
-3.58E-07
-3.70E-07
-3.79E-07
-3.86E-07
-3.56E-07
-3.45E-07
-3.18E-07
Total Dose (krad(Si))
20
30
-3.74E-07 -3.88E-07
-4.03E-07 -4.22E-07
-3.95E-07 -4.10E-07
-3.95E-07 -4.07E-07
-3.87E-07 -3.95E-07
-3.95E-07 -4.19E-07
-4.02E-07 -4.26E-07
-4.12E-07 -4.34E-07
-3.83E-07 -4.01E-07
-3.70E-07 -3.84E-07
-3.18E-07 -3.19E-07
-3.25E-07
1.07E-08
-2.96E-07
-3.55E-07
-3.63E-07
9.94E-09
-3.36E-07
-3.90E-07
-3.91E-07
1.08E-08
-3.61E-07
-4.20E-07
-4.04E-07
1.33E-08
-3.68E-07
-4.41E-07
-4.27E-07
1.79E-08
-3.77E-07
-4.76E-07
-4.77E-07
2.20E-08
-4.16E-07
-5.37E-07
-4.77E-07
2.16E-08
-4.18E-07
-5.36E-07
-4.05E-07
1.41E-08
-3.66E-07
-4.43E-07
-3.38E-07
1.63E-08
-2.93E-07
-3.82E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.67E-07
1.66E-08
-3.22E-07
-4.13E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.92E-07
1.65E-08
-3.47E-07
-4.38E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.13E-07
2.01E-08
-3.58E-07
-4.68E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.57E-07
1.93E-08
-4.04E-07
-5.10E-07
-1.00E-06
PASS
1.00E-06
PASS
-5.57E-07
3.87E-08
-4.51E-07
-6.63E-07
-1.50E-06
PASS
1.50E-06
PASS
-5.50E-07
3.74E-08
-4.48E-07
-6.53E-07
-1.50E-06
PASS
1.50E-06
PASS
-4.32E-07
2.48E-08
-3.64E-07
-5.00E-07
-1.50E-06
PASS
1.50E-06
PASS
50
-3.98E-07
-4.44E-07
-4.37E-07
-4.31E-07
-4.23E-07
-4.42E-07
-4.63E-07
-4.88E-07
-4.52E-07
-4.40E-07
-3.17E-07
An ISO 9001:2008 and DLA Certified Company
24
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.9. Plot of Negative Input Bias Current_1 (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
25
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for Negative Input Bias Current_1 (A) @ VS=+/-15V, VCM=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current_1 (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
100
-4.09E-07
-4.44E-07
-4.30E-07
-4.26E-07
-4.02E-07
-5.37E-07
-5.58E-07
-5.70E-07
-5.21E-07
-4.77E-07
-3.13E-07
24-hr
Anneal
110
-4.09E-07
-4.44E-07
-4.29E-07
-4.27E-07
-4.02E-07
-5.32E-07
-5.52E-07
-5.67E-07
-5.16E-07
-4.73E-07
-3.12E-07
168-hr
Anneal
120
-3.61E-07
-3.91E-07
-3.79E-07
-3.85E-07
-3.62E-07
-4.24E-07
-4.41E-07
-4.47E-07
-4.09E-07
-3.88E-07
-3.12E-07
0
-3.05E-07
-3.31E-07
-3.24E-07
-3.38E-07
-3.12E-07
-3.37E-07
-3.52E-07
-3.54E-07
-3.22E-07
-3.15E-07
-3.14E-07
10
-3.31E-07
-3.51E-07
-3.48E-07
-3.56E-07
-3.37E-07
-3.65E-07
-3.79E-07
-3.81E-07
-3.50E-07
-3.42E-07
-3.13E-07
Total Dose (krad(Si))
20
30
-3.48E-07 -3.58E-07
-3.74E-07 -3.88E-07
-3.66E-07 -3.76E-07
-3.70E-07 -3.79E-07
-3.57E-07 -3.62E-07
-3.86E-07 -4.08E-07
-4.02E-07 -4.22E-07
-4.06E-07 -4.25E-07
-3.74E-07 -3.92E-07
-3.65E-07 -3.77E-07
-3.13E-07 -3.13E-07
-3.22E-07
1.33E-08
-2.86E-07
-3.58E-07
-3.44E-07
1.03E-08
-3.16E-07
-3.73E-07
-3.63E-07
1.04E-08
-3.34E-07
-3.91E-07
-3.72E-07
1.25E-08
-3.38E-07
-4.07E-07
-3.88E-07
1.47E-08
-3.48E-07
-4.29E-07
-4.22E-07
1.69E-08
-3.76E-07
-4.69E-07
-4.22E-07
1.67E-08
-3.76E-07
-4.68E-07
-3.75E-07
1.34E-08
-3.39E-07
-4.12E-07
-3.36E-07
1.75E-08
-2.88E-07
-3.84E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.63E-07
1.72E-08
-3.16E-07
-4.11E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.87E-07
1.73E-08
-3.39E-07
-4.34E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.05E-07
2.03E-08
-3.49E-07
-4.61E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.44E-07
1.97E-08
-3.90E-07
-4.98E-07
-1.00E-06
PASS
1.00E-06
PASS
-5.32E-07
3.64E-08
-4.33E-07
-6.32E-07
-1.50E-06
PASS
1.50E-06
PASS
-5.28E-07
3.62E-08
-4.29E-07
-6.27E-07
-1.50E-06
PASS
1.50E-06
PASS
-4.22E-07
2.41E-08
-3.56E-07
-4.88E-07
-1.50E-06
PASS
1.50E-06
PASS
50
-3.65E-07
-4.03E-07
-3.95E-07
-3.96E-07
-3.83E-07
-4.28E-07
-4.55E-07
-4.72E-07
-4.38E-07
-4.26E-07
-3.12E-07
An ISO 9001:2008 and DLA Certified Company
26
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.10. Plot of Negative Input Bias Current_2 (A) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
27
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for Negative Input Bias Current_2 (A) @ VS=+/-15V, VCM=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Negative Input Bias Current_2 (A)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
100
-4.27E-07
-4.53E-07
-4.43E-07
-4.42E-07
-4.10E-07
-5.67E-07
-5.68E-07
-5.85E-07
-5.29E-07
-4.92E-07
-3.15E-07
24-hr
Anneal
110
-4.27E-07
-4.53E-07
-4.42E-07
-4.43E-07
-4.10E-07
-5.61E-07
-5.62E-07
-5.82E-07
-5.23E-07
-4.88E-07
-3.14E-07
168-hr
Anneal
120
-3.74E-07
-3.97E-07
-3.88E-07
-3.97E-07
-3.68E-07
-4.43E-07
-4.49E-07
-4.57E-07
-4.15E-07
-3.99E-07
-3.14E-07
0
-3.08E-07
-3.20E-07
-3.22E-07
-3.33E-07
-3.10E-07
-3.39E-07
-3.51E-07
-3.54E-07
-3.22E-07
-3.15E-07
-3.16E-07
10
-3.35E-07
-3.48E-07
-3.50E-07
-3.57E-07
-3.37E-07
-3.71E-07
-3.80E-07
-3.85E-07
-3.53E-07
-3.47E-07
-3.15E-07
Total Dose (krad(Si))
20
30
-3.57E-07 -3.69E-07
-3.74E-07 -3.89E-07
-3.71E-07 -3.83E-07
-3.76E-07 -3.87E-07
-3.60E-07 -3.66E-07
-3.96E-07 -4.21E-07
-4.03E-07 -4.25E-07
-4.09E-07 -4.31E-07
-3.77E-07 -3.97E-07
-3.71E-07 -3.85E-07
-3.15E-07 -3.15E-07
-3.18E-07
1.01E-08
-2.91E-07
-3.46E-07
-3.45E-07
9.01E-09
-3.21E-07
-3.70E-07
-3.67E-07
8.65E-09
-3.44E-07
-3.91E-07
-3.79E-07
1.04E-08
-3.50E-07
-4.07E-07
-3.96E-07
1.33E-08
-3.59E-07
-4.33E-07
-4.35E-07
1.66E-08
-3.89E-07
-4.80E-07
-4.35E-07
1.66E-08
-3.90E-07
-4.80E-07
-3.85E-07
1.33E-08
-3.48E-07
-4.21E-07
-3.36E-07
1.71E-08
-2.89E-07
-3.83E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.67E-07
1.65E-08
-3.22E-07
-4.12E-07
-5.00E-07
PASS
5.00E-07
PASS
-3.91E-07
1.63E-08
-3.47E-07
-4.36E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.12E-07
1.99E-08
-3.57E-07
-4.66E-07
-7.50E-07
PASS
7.50E-07
PASS
-4.52E-07
1.82E-08
-4.03E-07
-5.02E-07
-1.00E-06
PASS
1.00E-06
PASS
-5.48E-07
3.78E-08
-4.45E-07
-6.52E-07
-1.50E-06
PASS
1.50E-06
PASS
-5.43E-07
3.73E-08
-4.41E-07
-6.46E-07
-1.50E-06
PASS
1.50E-06
PASS
-4.33E-07
2.46E-08
-3.65E-07
-5.00E-07
-1.50E-06
PASS
1.50E-06
PASS
50
-3.76E-07
-4.05E-07
-4.03E-07
-4.07E-07
-3.88E-07
-4.42E-07
-4.60E-07
-4.81E-07
-4.43E-07
-4.36E-07
-3.14E-07
An ISO 9001:2008 and DLA Certified Company
28
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.11. Plot of Large Signal Voltage Gain_1 (V/mV) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
29
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Large Signal Voltage Gain_1 (V/mV) @ VS=+/-15V, VCM=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain_1 (V/mV)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
100
4.70E+01
4.84E+01
4.80E+01
4.68E+01
4.85E+01
4.85E+01
4.86E+01
4.90E+01
4.91E+01
4.86E+01
4.94E+01
24-hr
Anneal
110
4.72E+01
4.84E+01
4.79E+01
4.70E+01
4.85E+01
4.86E+01
4.85E+01
4.92E+01
4.90E+01
4.86E+01
4.94E+01
168-hr
Anneal
120
4.72E+01
4.86E+01
4.81E+01
4.70E+01
4.85E+01
4.90E+01
4.87E+01
4.92E+01
4.92E+01
4.88E+01
4.93E+01
0
4.80E+01
4.97E+01
4.89E+01
4.84E+01
4.95E+01
5.00E+01
4.93E+01
4.99E+01
5.01E+01
4.93E+01
4.93E+01
10
4.84E+01
4.95E+01
4.90E+01
4.81E+01
4.94E+01
4.98E+01
4.94E+01
5.01E+01
5.00E+01
4.96E+01
4.93E+01
Total Dose (krad(Si))
20
30
4.78E+01 4.78E+01
4.91E+01 4.88E+01
4.86E+01 4.98E+01
4.78E+01 4.77E+01
4.91E+01 4.90E+01
4.97E+01 4.95E+01
4.92E+01 4.92E+01
5.00E+01 4.99E+01
5.01E+01 4.98E+01
4.94E+01 4.93E+01
4.95E+01 4.95E+01
4.89E+01
7.18E-01
5.09E+01
4.69E+01
4.89E+01
6.14E-01
5.06E+01
4.72E+01
4.85E+01
6.53E-01
5.03E+01
4.67E+01
4.86E+01
8.79E-01
5.10E+01
4.62E+01
4.82E+01
6.27E-01
5.00E+01
4.65E+01
4.77E+01
7.92E-01
4.99E+01
4.56E+01
4.78E+01
6.82E-01
4.97E+01
4.59E+01
4.79E+01
7.40E-01
4.99E+01
4.59E+01
4.97E+01
3.90E-01
5.08E+01
4.87E+01
1.00E+01
PASS
4.98E+01
2.86E-01
5.06E+01
4.90E+01
1.00E+01
PASS
4.97E+01
3.83E-01
5.07E+01
4.86E+01
1.00E+01
PASS
4.95E+01
3.05E-01
5.04E+01
4.87E+01
1.00E+01
PASS
4.93E+01
2.51E-01
4.99E+01
4.86E+01
1.00E+01
PASS
4.88E+01
2.70E-01
4.95E+01
4.80E+01
1.00E+01
PASS
4.88E+01
3.03E-01
4.96E+01
4.79E+01
1.00E+01
PASS
4.90E+01
2.28E-01
4.96E+01
4.84E+01
1.00E+01
PASS
50
4.77E+01
4.90E+01
4.84E+01
4.75E+01
4.86E+01
4.93E+01
4.90E+01
4.95E+01
4.95E+01
4.90E+01
4.92E+01
An ISO 9001:2008 and DLA Certified Company
30
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.12. Plot of Large Signal Voltage Gain_2 (V/mV) @ VS=+/-15V, VCM=0V versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
31
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Large Signal Voltage Gain_2 (V/mV) @ VS=+/-15V, VCM=0V versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Large Signal Voltage Gain_2 (V/mV)
@ VS=+/-15V, VCM=0V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
100
5.08E+01
5.18E+01
4.92E+01
4.89E+01
4.94E+01
5.27E+01
5.22E+01
5.03E+01
5.03E+01
5.17E+01
5.17E+01
24-hr
Anneal
110
5.05E+01
5.18E+01
4.90E+01
4.89E+01
4.93E+01
5.27E+01
5.18E+01
5.04E+01
5.01E+01
5.17E+01
5.16E+01
168-hr
Anneal
120
5.05E+01
5.22E+01
4.94E+01
4.92E+01
4.94E+01
5.34E+01
5.23E+01
5.08E+01
5.03E+01
5.22E+01
5.17E+01
0
5.17E+01
5.37E+01
5.07E+01
5.03E+01
5.07E+01
5.46E+01
5.31E+01
5.15E+01
5.16E+01
5.31E+01
5.17E+01
10
5.16E+01
5.31E+01
5.04E+01
5.03E+01
5.03E+01
5.43E+01
5.30E+01
5.14E+01
5.14E+01
5.29E+01
5.19E+01
Total Dose (krad(Si))
20
30
5.13E+01 5.09E+01
5.26E+01 5.29E+01
4.99E+01 4.99E+01
4.98E+01 4.96E+01
5.00E+01 4.98E+01
5.39E+01 5.37E+01
5.30E+01 5.27E+01
5.14E+01 5.11E+01
5.13E+01 5.11E+01
5.28E+01 5.26E+01
5.16E+01 5.17E+01
5.14E+01
1.38E+00
5.52E+01
4.76E+01
5.11E+01
1.23E+00
5.45E+01
4.78E+01
5.07E+01
1.22E+00
5.41E+01
4.74E+01
5.06E+01
1.37E+00
5.44E+01
4.69E+01
5.04E+01
1.32E+00
5.40E+01
4.67E+01
5.00E+01
1.23E+00
5.34E+01
4.66E+01
4.99E+01
1.24E+00
5.33E+01
4.65E+01
5.01E+01
1.26E+00
5.36E+01
4.67E+01
5.28E+01
1.28E+00
5.63E+01
4.93E+01
1.00E+01
PASS
5.26E+01
1.23E+00
5.60E+01
4.92E+01
1.00E+01
PASS
5.25E+01
1.11E+00
5.55E+01
4.94E+01
1.00E+01
PASS
5.22E+01
1.13E+00
5.53E+01
4.92E+01
1.00E+01
PASS
5.20E+01
1.16E+00
5.52E+01
4.89E+01
1.00E+01
PASS
5.14E+01
1.10E+00
5.45E+01
4.84E+01
1.00E+01
PASS
5.13E+01
1.07E+00
5.43E+01
4.84E+01
1.00E+01
PASS
5.18E+01
1.25E+00
5.52E+01
4.84E+01
1.00E+01
PASS
50
5.10E+01
5.24E+01
4.96E+01
4.93E+01
4.95E+01
5.36E+01
5.26E+01
5.10E+01
5.08E+01
5.22E+01
5.18E+01
An ISO 9001:2008 and DLA Certified Company
32
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.13. Plot of Common Mode Rejection Ratio_1 (dB) @ VS=+/-15V, VCM=+/-10V versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
33
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Common Mode Rejection Ratio_1 (dB) @ VS=+/-15V, VCM=+/-10V versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio_1 (dB)
@ VS=+/-15V, VCM=+/-10V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
100
1.13E+02
1.53E+02
1.22E+02
1.43E+02
1.23E+02
1.22E+02
1.16E+02
1.26E+02
1.31E+02
1.14E+02
1.58E+02
24-hr
Anneal
110
1.13E+02
1.59E+02
1.22E+02
1.42E+02
1.22E+02
1.22E+02
1.16E+02
1.26E+02
1.31E+02
1.14E+02
1.64E+02
168-hr
Anneal
120
1.13E+02
1.50E+02
1.22E+02
1.43E+02
1.23E+02
1.22E+02
1.16E+02
1.25E+02
1.33E+02
1.14E+02
1.63E+02
0
1.13E+02
1.42E+02
1.22E+02
1.40E+02
1.22E+02
1.22E+02
1.16E+02
1.25E+02
1.32E+02
1.14E+02
1.55E+02
10
1.13E+02
1.48E+02
1.22E+02
1.42E+02
1.22E+02
1.22E+02
1.16E+02
1.25E+02
1.32E+02
1.14E+02
1.54E+02
Total Dose (krad(Si))
20
30
1.13E+02 1.13E+02
1.48E+02 1.58E+02
1.22E+02 1.22E+02
1.41E+02 1.41E+02
1.22E+02 1.22E+02
1.21E+02 1.22E+02
1.16E+02 1.16E+02
1.25E+02 1.25E+02
1.32E+02 1.31E+02
1.14E+02 1.14E+02
1.67E+02 1.57E+02
1.28E+02
1.25E+01
1.62E+02
9.36E+01
1.29E+02
1.50E+01
1.70E+02
8.84E+01
1.29E+02
1.48E+01
1.70E+02
8.84E+01
1.31E+02
1.80E+01
1.80E+02
8.16E+01
1.30E+02
1.59E+01
1.73E+02
8.60E+01
1.30E+02
1.66E+01
1.76E+02
8.51E+01
1.32E+02
1.88E+01
1.83E+02
8.01E+01
1.30E+02
1.57E+01
1.73E+02
8.69E+01
1.22E+02
7.44E+00
1.42E+02
1.01E+02
9.00E+01
PASS
1.22E+02
7.22E+00
1.42E+02
1.02E+02
9.00E+01
PASS
1.22E+02
7.18E+00
1.41E+02
1.02E+02
9.00E+01
PASS
1.22E+02
7.06E+00
1.41E+02
1.02E+02
9.00E+01
PASS
1.22E+02
7.23E+00
1.42E+02
1.02E+02
9.00E+01
PASS
1.22E+02
7.05E+00
1.41E+02
1.02E+02
9.00E+01
PASS
1.22E+02
7.11E+00
1.41E+02
1.02E+02
9.00E+01
PASS
1.22E+02
7.58E+00
1.43E+02
1.01E+02
9.00E+01
PASS
50
1.13E+02
1.52E+02
1.22E+02
1.40E+02
1.22E+02
1.22E+02
1.16E+02
1.25E+02
1.32E+02
1.14E+02
1.52E+02
An ISO 9001:2008 and DLA Certified Company
34
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.14. Plot of Common Mode Rejection Ratio_2 (dB) @ VS=+/-15V, VCM=+/-10V versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
35
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Common Mode Rejection Ratio_2 (dB) @ VS=+/-15V, VCM=+/-10V versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio_2 (dB)
@ VS=+/-15V, VCM=+/-10V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
100
1.44E+02
1.18E+02
1.20E+02
1.11E+02
1.30E+02
1.14E+02
1.15E+02
1.12E+02
1.17E+02
1.29E+02
1.12E+02
24-hr
Anneal
110
1.42E+02
1.18E+02
1.20E+02
1.11E+02
1.29E+02
1.14E+02
1.15E+02
1.12E+02
1.17E+02
1.29E+02
1.12E+02
168-hr
Anneal
120
1.40E+02
1.18E+02
1.20E+02
1.11E+02
1.29E+02
1.14E+02
1.15E+02
1.12E+02
1.16E+02
1.28E+02
1.12E+02
0
1.40E+02
1.18E+02
1.20E+02
1.11E+02
1.29E+02
1.14E+02
1.15E+02
1.12E+02
1.17E+02
1.28E+02
1.12E+02
10
1.39E+02
1.18E+02
1.20E+02
1.11E+02
1.29E+02
1.14E+02
1.15E+02
1.12E+02
1.17E+02
1.28E+02
1.12E+02
Total Dose (krad(Si))
20
30
1.41E+02 1.40E+02
1.18E+02 1.18E+02
1.20E+02 1.20E+02
1.11E+02 1.11E+02
1.29E+02 1.28E+02
1.14E+02 1.14E+02
1.15E+02 1.15E+02
1.12E+02 1.12E+02
1.17E+02 1.17E+02
1.28E+02 1.28E+02
1.12E+02 1.12E+02
1.24E+02
1.11E+01
1.54E+02
9.30E+01
1.23E+02
1.09E+01
1.53E+02
9.34E+01
1.24E+02
1.14E+01
1.55E+02
9.22E+01
1.23E+02
1.13E+01
1.54E+02
9.24E+01
1.23E+02
1.10E+01
1.53E+02
9.32E+01
1.25E+02
1.27E+01
1.60E+02
8.97E+01
1.24E+02
1.18E+01
1.56E+02
9.16E+01
1.24E+02
1.13E+01
1.55E+02
9.29E+01
1.17E+02
6.20E+00
1.34E+02
1.00E+02
9.00E+01
PASS
1.17E+02
6.21E+00
1.34E+02
1.00E+02
9.00E+01
PASS
1.17E+02
6.36E+00
1.35E+02
9.98E+01
9.00E+01
PASS
1.17E+02
6.37E+00
1.35E+02
9.97E+01
9.00E+01
PASS
1.17E+02
6.36E+00
1.35E+02
9.97E+01
9.00E+01
PASS
1.17E+02
6.56E+00
1.35E+02
9.93E+01
9.00E+01
PASS
1.17E+02
6.63E+00
1.36E+02
9.92E+01
9.00E+01
PASS
1.17E+02
6.31E+00
1.35E+02
9.99E+01
9.00E+01
PASS
50
1.40E+02
1.18E+02
1.20E+02
1.11E+02
1.29E+02
1.14E+02
1.15E+02
1.12E+02
1.17E+02
1.28E+02
1.12E+02
An ISO 9001:2008 and DLA Certified Company
36
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.15. Plot of Saturation Voltage1_1 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
37
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for Saturation Voltage1_1 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV,
ISINK=3.2mA versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Saturation Voltage1_1 (V)
@ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
100
3.04E-01
3.07E-01
3.10E-01
3.09E-01
3.08E-01
3.13E-01
3.11E-01
3.11E-01
3.13E-01
3.07E-01
3.07E-01
24-hr
Anneal
110
3.04E-01
3.07E-01
3.10E-01
3.09E-01
3.08E-01
3.12E-01
3.11E-01
3.10E-01
3.13E-01
3.07E-01
3.06E-01
168-hr
Anneal
120
3.06E-01
3.09E-01
3.11E-01
3.10E-01
3.10E-01
3.14E-01
3.13E-01
3.12E-01
3.14E-01
3.09E-01
3.09E-01
0
2.99E-01
3.00E-01
3.04E-01
3.03E-01
3.03E-01
3.08E-01
3.09E-01
3.07E-01
3.09E-01
3.05E-01
3.07E-01
10
2.98E-01
3.01E-01
3.04E-01
3.03E-01
3.03E-01
3.07E-01
3.06E-01
3.06E-01
3.08E-01
3.03E-01
3.07E-01
Total Dose (krad(Si))
20
30
2.99E-01 3.00E-01
3.02E-01 3.02E-01
3.04E-01 3.05E-01
3.03E-01 3.05E-01
3.04E-01 3.04E-01
3.07E-01 3.08E-01
3.08E-01 3.08E-01
3.06E-01 3.07E-01
3.08E-01 3.09E-01
3.04E-01 3.05E-01
3.06E-01 3.07E-01
3.02E-01
2.17E-03
3.08E-01
2.96E-01
3.02E-01
2.39E-03
3.08E-01
2.95E-01
3.02E-01
2.07E-03
3.08E-01
2.97E-01
3.03E-01
2.17E-03
3.09E-01
2.97E-01
3.04E-01
2.68E-03
3.12E-01
2.97E-01
3.08E-01
2.30E-03
3.14E-01
3.01E-01
3.08E-01
2.30E-03
3.14E-01
3.01E-01
3.09E-01
1.92E-03
3.14E-01
3.04E-01
3.08E-01
1.67E-03
3.12E-01
3.03E-01
4.00E-01
PASS
3.06E-01
1.87E-03
3.11E-01
3.01E-01
4.00E-01
PASS
3.07E-01
1.67E-03
3.11E-01
3.02E-01
4.00E-01
PASS
3.07E-01
1.52E-03
3.12E-01
3.03E-01
4.00E-01
PASS
3.08E-01
1.92E-03
3.13E-01
3.03E-01
4.00E-01
PASS
3.11E-01
2.45E-03
3.18E-01
3.04E-01
4.00E-01
PASS
3.11E-01
2.30E-03
3.17E-01
3.04E-01
4.00E-01
PASS
3.12E-01
2.07E-03
3.18E-01
3.07E-01
4.00E-01
PASS
50
3.00E-01
3.03E-01
3.06E-01
3.06E-01
3.06E-01
3.09E-01
3.09E-01
3.08E-01
3.10E-01
3.05E-01
3.06E-01
An ISO 9001:2008 and DLA Certified Company
38
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.16. Plot of Saturation Voltage1_2 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
39
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.16. Raw data for Saturation Voltage1_2 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV,
ISINK=3.2mA versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Saturation Voltage1_2 (V)
@ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
100
3.06E-01
3.07E-01
3.09E-01
3.11E-01
3.05E-01
3.10E-01
3.11E-01
3.11E-01
3.11E-01
3.05E-01
3.07E-01
24-hr
Anneal
110
3.06E-01
3.07E-01
3.09E-01
3.11E-01
3.05E-01
3.10E-01
3.11E-01
3.11E-01
3.11E-01
3.05E-01
3.06E-01
168-hr
Anneal
120
3.08E-01
3.10E-01
3.10E-01
3.13E-01
3.07E-01
3.11E-01
3.12E-01
3.12E-01
3.12E-01
3.06E-01
3.08E-01
0
3.02E-01
3.01E-01
3.04E-01
3.07E-01
3.01E-01
3.06E-01
3.08E-01
3.07E-01
3.08E-01
3.03E-01
3.06E-01
10
3.01E-01
3.01E-01
3.03E-01
3.05E-01
3.00E-01
3.05E-01
3.06E-01
3.05E-01
3.06E-01
3.01E-01
3.06E-01
Total Dose (krad(Si))
20
30
3.02E-01 3.02E-01
3.02E-01 3.03E-01
3.04E-01 3.05E-01
3.06E-01 3.06E-01
3.01E-01 3.01E-01
3.05E-01 3.06E-01
3.06E-01 3.06E-01
3.05E-01 3.06E-01
3.06E-01 3.07E-01
3.01E-01 3.02E-01
3.06E-01 3.06E-01
3.03E-01
2.55E-03
3.10E-01
2.96E-01
3.02E-01
2.00E-03
3.07E-01
2.97E-01
3.03E-01
2.00E-03
3.08E-01
2.98E-01
3.03E-01
2.07E-03
3.09E-01
2.98E-01
3.04E-01
2.39E-03
3.11E-01
2.98E-01
3.08E-01
2.41E-03
3.14E-01
3.01E-01
3.08E-01
2.41E-03
3.14E-01
3.01E-01
3.10E-01
2.30E-03
3.16E-01
3.03E-01
3.06E-01
2.07E-03
3.12E-01
3.01E-01
4.00E-01
PASS
3.05E-01
2.07E-03
3.10E-01
2.99E-01
4.00E-01
PASS
3.05E-01
2.07E-03
3.10E-01
2.99E-01
4.00E-01
PASS
3.05E-01
1.95E-03
3.11E-01
3.00E-01
4.00E-01
PASS
3.06E-01
1.92E-03
3.11E-01
3.01E-01
4.00E-01
PASS
3.10E-01
2.61E-03
3.17E-01
3.02E-01
4.00E-01
PASS
3.10E-01
2.61E-03
3.17E-01
3.02E-01
4.00E-01
PASS
3.11E-01
2.61E-03
3.18E-01
3.03E-01
4.00E-01
PASS
50
3.02E-01
3.03E-01
3.05E-01
3.08E-01
3.03E-01
3.06E-01
3.07E-01
3.07E-01
3.08E-01
3.03E-01
3.06E-01
An ISO 9001:2008 and DLA Certified Company
40
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.17. Plot of Saturation Voltage2_1 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA versus total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all
pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
41
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.17. Raw data for Saturation Voltage2_1 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA versus
total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Saturation Voltage2_1 (V)
@ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
100
6.18E-01
6.28E-01
6.29E-01
6.33E-01
6.23E-01
6.35E-01
6.32E-01
6.39E-01
6.39E-01
6.29E-01
6.21E-01
24-hr
Anneal
110
6.18E-01
6.26E-01
6.31E-01
6.31E-01
6.21E-01
6.35E-01
6.32E-01
6.36E-01
6.37E-01
6.28E-01
6.22E-01
168-hr
Anneal
120
6.30E-01
6.33E-01
6.37E-01
6.40E-01
6.31E-01
6.41E-01
6.40E-01
6.45E-01
6.46E-01
6.34E-01
6.30E-01
0
6.14E-01
6.18E-01
6.24E-01
6.25E-01
6.19E-01
6.29E-01
6.30E-01
6.33E-01
6.31E-01
6.23E-01
6.23E-01
10
6.14E-01
6.22E-01
6.24E-01
6.25E-01
6.18E-01
6.28E-01
6.26E-01
6.30E-01
6.30E-01
6.21E-01
6.21E-01
Total Dose (krad(Si))
20
30
6.19E-01 6.18E-01
6.23E-01 6.24E-01
6.28E-01 6.29E-01
6.28E-01 6.29E-01
6.20E-01 6.22E-01
6.31E-01 6.31E-01
6.28E-01 6.29E-01
6.31E-01 6.33E-01
6.29E-01 6.32E-01
6.23E-01 6.23E-01
6.20E-01 6.21E-01
6.20E-01
4.53E-03
6.32E-01
6.08E-01
6.21E-01
4.56E-03
6.33E-01
6.08E-01
6.24E-01
4.28E-03
6.35E-01
6.12E-01
6.24E-01
4.72E-03
6.37E-01
6.11E-01
6.25E-01
4.32E-03
6.37E-01
6.13E-01
6.26E-01
5.81E-03
6.42E-01
6.10E-01
6.25E-01
5.86E-03
6.41E-01
6.09E-01
6.34E-01
4.21E-03
6.46E-01
6.23E-01
6.29E-01
3.77E-03
6.40E-01
6.19E-01
1.50E+00
PASS
6.27E-01
3.74E-03
6.37E-01
6.17E-01
1.50E+00
PASS
6.28E-01
3.29E-03
6.37E-01
6.19E-01
1.50E+00
PASS
6.30E-01
3.97E-03
6.40E-01
6.19E-01
1.50E+00
PASS
6.32E-01
3.94E-03
6.43E-01
6.21E-01
1.50E+00
PASS
6.35E-01
4.38E-03
6.47E-01
6.23E-01
1.50E+00
PASS
6.34E-01
3.65E-03
6.44E-01
6.24E-01
1.50E+00
PASS
6.41E-01
4.76E-03
6.54E-01
6.28E-01
1.50E+00
PASS
50
6.20E-01
6.25E-01
6.29E-01
6.30E-01
6.22E-01
6.32E-01
6.31E-01
6.35E-01
6.36E-01
6.26E-01
6.22E-01
An ISO 9001:2008 and DLA Certified Company
42
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.18. Plot of Saturation Voltage2_2 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA versus total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical
bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all
pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
43
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Table 5.18. Raw data for Saturation Voltage2_2 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA versus
total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Saturation Voltage2_2 (V)
@ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
100
6.13E-01
6.17E-01
6.23E-01
6.29E-01
6.12E-01
6.26E-01
6.26E-01
6.27E-01
6.28E-01
6.18E-01
6.19E-01
24-hr
Anneal
110
6.12E-01
6.17E-01
6.23E-01
6.28E-01
6.11E-01
6.25E-01
6.27E-01
6.26E-01
6.29E-01
6.18E-01
6.20E-01
168-hr
Anneal
120
6.23E-01
6.24E-01
6.32E-01
6.38E-01
6.21E-01
6.33E-01
6.34E-01
6.34E-01
6.38E-01
6.27E-01
6.28E-01
0
6.11E-01
6.12E-01
6.19E-01
6.24E-01
6.10E-01
6.21E-01
6.24E-01
6.22E-01
6.24E-01
6.15E-01
6.21E-01
10
6.08E-01
6.11E-01
6.18E-01
6.22E-01
6.07E-01
6.19E-01
6.20E-01
6.18E-01
6.21E-01
6.12E-01
6.19E-01
Total Dose (krad(Si))
20
30
6.12E-01 6.13E-01
6.14E-01 6.16E-01
6.21E-01 6.22E-01
6.26E-01 6.26E-01
6.09E-01 6.12E-01
6.21E-01 6.22E-01
6.21E-01 6.23E-01
6.20E-01 6.21E-01
6.21E-01 6.23E-01
6.13E-01 6.14E-01
6.20E-01 6.20E-01
6.15E-01
6.06E-03
6.32E-01
5.99E-01
6.13E-01
6.53E-03
6.31E-01
5.95E-01
6.16E-01
6.95E-03
6.35E-01
5.97E-01
6.18E-01
6.02E-03
6.34E-01
6.01E-01
6.18E-01
6.42E-03
6.36E-01
6.01E-01
6.19E-01
7.16E-03
6.38E-01
5.99E-01
6.18E-01
7.26E-03
6.38E-01
5.98E-01
6.28E-01
7.16E-03
6.47E-01
6.08E-01
6.21E-01
3.70E-03
6.31E-01
6.11E-01
1.50E+00
PASS
6.18E-01
3.54E-03
6.28E-01
6.08E-01
1.50E+00
PASS
6.19E-01
3.49E-03
6.29E-01
6.10E-01
1.50E+00
PASS
6.21E-01
3.78E-03
6.31E-01
6.10E-01
1.50E+00
PASS
6.23E-01
3.58E-03
6.32E-01
6.13E-01
1.50E+00
PASS
6.25E-01
4.00E-03
6.36E-01
6.14E-01
1.50E+00
PASS
6.25E-01
4.18E-03
6.36E-01
6.14E-01
1.50E+00
PASS
6.33E-01
3.96E-03
6.44E-01
6.22E-01
1.50E+00
PASS
50
6.13E-01
6.15E-01
6.23E-01
6.27E-01
6.13E-01
6.23E-01
6.23E-01
6.23E-01
6.27E-01
6.17E-01
6.21E-01
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ELDRS Report
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(719) 531-0800
Figure 5.19. Plot of Output Leakage Current_1 (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DLA Certified Company
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Table 5.19. Raw data for Output Leakage Current_1 (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Output Leakage Current_1 (A)
@ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
2.00E-08
1.70E-08
1.40E-08
1.70E-08
1.10E-08
1.20E-08
1.00E-08
9.00E-09
1.00E-08
9.00E-09
8.00E-09
100
2.30E-08
2.30E-08
1.70E-08
2.10E-08
1.50E-08
1.20E-08
1.00E-08
1.00E-08
9.00E-09
1.00E-08
8.00E-09
24-hr
Anneal
110
2.00E-08
1.80E-08
1.40E-08
1.30E-08
9.00E-09
8.00E-09
8.00E-09
7.00E-09
8.00E-09
8.00E-09
6.00E-09
1.36E-08
2.97E-09
2.17E-08
5.47E-09
1.58E-08
3.42E-09
2.52E-08
6.42E-09
1.98E-08
3.63E-09
2.98E-08
9.84E-09
1.48E-08
4.32E-09
2.67E-08
2.94E-09
1.00E-08
1.87E-09
1.51E-08
4.87E-09
7.40E-09
8.94E-10
9.85E-09
4.95E-09
2.00E-06
PASS
1.00E-08
1.22E-09
1.34E-08
6.64E-09
2.00E-06
PASS
1.02E-08
1.10E-09
1.32E-08
7.20E-09
2.00E-06
PASS
7.80E-09
4.47E-10
9.03E-09
6.57E-09
2.00E-06
PASS
7.00E-09
7.07E-10
8.94E-09
5.06E-09
2.00E-06
PASS
Total Dose (krad(Si))
20
30
1.90E-08 1.80E-08
1.20E-08 1.40E-08
1.20E-08 1.20E-08
1.30E-08 1.40E-08
6.00E-09 1.00E-08
8.00E-09 8.00E-09
1.00E-08 8.00E-09
8.00E-09 8.00E-09
9.00E-09 7.00E-09
7.00E-09 6.00E-09
7.00E-09 6.00E-09
0
1.40E-08
1.10E-08
9.00E-09
9.00E-09
7.00E-09
9.00E-09
9.00E-09
1.00E-08
8.00E-09
7.00E-09
6.00E-09
10
2.00E-08
1.50E-08
1.40E-08
1.40E-08
9.00E-09
9.00E-09
1.00E-08
9.00E-09
9.00E-09
7.00E-09
7.00E-09
1.00E-08
2.65E-09
1.73E-08
2.75E-09
1.44E-08
3.91E-09
2.51E-08
3.67E-09
1.24E-08
4.62E-09
2.51E-08
-2.55E-10
8.60E-09
1.14E-09
1.17E-08
5.47E-09
2.00E-06
PASS
8.80E-09
1.10E-09
1.18E-08
5.80E-09
2.00E-06
PASS
8.40E-09
1.14E-09
1.15E-08
5.27E-09
2.00E-06
PASS
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168-hr
Anneal
120
1.20E-08
1.20E-08
9.00E-09
9.00E-09
8.00E-09
8.00E-09
7.00E-09
7.00E-09
7.00E-09
6.00E-09
5.00E-09
ELDRS Report
15-0663 03/17/16 R1.0
Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.20. Plot of Output Leakage Current_2 (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or
dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum
specification value as defined in the datasheet and/or test plan.
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Table 5.20. Raw data for Output Leakage Current_2 (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Output Leakage Current_2 (A)
@ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
Device
1802
1803
1804
1805
1806
1807
1808
1809
1841
1842
1850
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
50
6.00E-09
5.00E-09
5.00E-09
4.00E-09
2.00E-09
2.00E-09
0.00E+00
0.00E+00
1.00E-09
0.00E+00
1.00E-09
100
8.00E-09
8.00E-09
4.00E-09
8.00E-09
3.00E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
1.00E-09
2.00E-09
24-hr
Anneal
110
6.00E-09
4.00E-09
2.00E-09
3.00E-09
2.00E-09
2.00E-09
2.00E-09
2.00E-09
2.00E-09
3.00E-09
3.00E-09
2.40E-09
1.67E-09
6.99E-09
-2.19E-09
4.40E-09
1.52E-09
8.56E-09
2.42E-10
6.20E-09
2.49E-09
1.30E-08
-6.28E-10
3.40E-09
1.67E-09
7.99E-09
-1.19E-09
4.00E-10
5.48E-10
1.90E-09
-1.10E-09
2.60E-09
1.52E-09
6.76E-09
-1.56E-09
2.00E-06
PASS
6.00E-10
8.94E-10
3.05E-09
-1.85E-09
2.00E-06
PASS
2.00E-10
4.47E-10
1.43E-09
-1.03E-09
2.00E-06
PASS
2.20E-09
4.47E-10
3.43E-09
9.74E-10
2.00E-06
PASS
3.60E-09
5.48E-10
5.10E-09
2.10E-09
2.00E-06
PASS
0
2.00E-09
0.00E+00
1.00E-09
0.00E+00
1.00E-09
2.00E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
0.00E+00
10
6.00E-09
2.00E-09
2.00E-09
2.00E-09
0.00E+00
1.00E-09
2.00E-09
2.00E-09
1.00E-09
2.00E-09
3.00E-09
Total Dose (krad(Si))
20
30
4.00E-09 4.00E-09
2.00E-09 4.00E-09
1.00E-09 2.00E-09
2.00E-09 2.00E-09
0.00E+00 0.00E+00
2.00E-09 0.00E+00
1.00E-09 3.00E-09
2.00E-09 3.00E-09
3.00E-09 3.00E-09
2.00E-09 4.00E-09
4.00E-09 5.00E-09
8.00E-10
8.37E-10
3.09E-09
-1.49E-09
2.40E-09
2.19E-09
8.41E-09
-3.61E-09
1.80E-09
1.48E-09
5.87E-09
-2.27E-09
4.00E-10
8.94E-10
2.85E-09
-2.05E-09
2.00E-06
PASS
1.60E-09
5.48E-10
3.10E-09
9.81E-11
2.00E-06
PASS
2.00E-09
7.07E-10
3.94E-09
6.11E-11
2.00E-06
PASS
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168-hr
Anneal
120
1.00E-09
0.00E+00
0.00E+00
0.00E+00
1.00E-09
4.00E-09
4.00E-09
3.00E-09
3.00E-09
4.00E-09
4.00E-09
ELDRS Report
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Aeroflex RAD
5030 Centennial Blvd.
Colorado Springs, CO 80919
(719) 531-0800
6.0. Summary / Conclusions
The low dose rate testing described in this final report was performed using the facilities at Aeroflex
RAD's Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s, determined by the distance
from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
Based on this criterion the RH119W High Performance Dual Comparator (from the lot date code
identified on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the
maximum tested dose level of 100krad(Si) with all parameters remaining within their datasheet
specifications. Further, the data in this report can be analyzed along with the high dose rate report titled
"Total Ionizing Dose (TID) Radiation Testing of the RH119W High Performance Dual Comparator for
Linear Technology" to demonstrate that these parts do not exhibit ELDRS as defined in the current test
method.
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ELDRS Report
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Appendix A: Photograph of Packing Label and a Sample Unit-Under-Test to Show Part
Traceability
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Appendix B: Radiation Bias Connections and Absolute Maximum Ratings
ELDRS Radiation Biased Conditions: Extracted from Linear Technology RH119 Datasheet I.D No.
66-10-0176 Revision C.
Pin
1
2
3
4
5
6
7
8
9
10
Function
Connection / Bias
OUT 1
To +15V via 10kΩ Resistor
GND 1
To GND
+IN 1
To Pin 8
To Pin 9,
-IN 1
To +15V via 10kΩ Resistor,
To Pin 8 via 100Ω Resistor
VTo -15V
OUT 2
To +15V via 10kΩ Resistor
GND 2
To GND
To Pin 3,
+IN 2
To -15V via 10kΩ Resistor,
To Pin 4 via 100Ω Resistor
-IN 2
To Pin 4
V+
To +15V
Figure B.1. Irradiation bias circuit. This figure was extracted from Linear Technology RH119 Datasheet I.D No.
66-10-0176 Revision C.
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ELDRS Radiation Unbiased Conditions: All pins grounded.
Pin
1
2
3
4
5
6
7
8
9
10
Function
OUT 1
GND 1
+IN 1
-IN 1
VOUT 2
GND 2
+IN 2
-IN 2
V+
Connection / Bias
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
Figure B.2. W Package drawing (for reference only). This figure was extracted from Linear Technology RH119
Datasheet I.D No. 66-10-0176 Revision C.
Absolute Maximum Ratings:
Parameter
Supply Voltage
Output to Negative Supply Voltage
Ground to Negative Supply Voltage
Ground to Positive Supply Voltage
Differential Input Voltage
Differential Input Current
Output Short-Circuit Duration
Max Rating
36V
36V
25V
18V
±5V
±5mA
10 sec
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Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
RH119 Datasheet I.D No. 66-10-0176 Revision C. All electrical tests for this device are performed on
one of Aeroflex RAD's LTS2020 Test Systems. The LTS2020 Test System is a programmable
parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal
products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020
Test System achieves accuracy and sensitivity through the use of software self-calibration and an
internal relay matrix with separate family boards and custom personality adapter boards. The tester uses
this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and
establish the needed measurement loops for all the tests performed. The measured parameters and test
conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020
for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table
C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between
tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90
KTL statistics were applied to the measured standard deviation to generate the final measurement range.
This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH119W High Performance Dual Comparator.
Parameter
Symbol
Test Conditions
Positive Supply Current (A)
+IS
VS=+/-15V, VCM=0V
Negative Supply Current (A)
-IS
VS=+/-15V, VCM=0V
Offset Voltage (V)
VOS
VS=+/-15V, VCM=0V
Input Offset Current (A)
IOS
VS=+/-15V, VCM=0V
Positive Input Bias Current (A)
+IB
VS=+/-15V, VCM=0V
Negative Input Bias Current (A)
-IB
VS=+/-15V, VCM=0V
Large Signal Voltage Gain (V/mV)
AVOL
VS=+/-15V, VCM=0V
Common Mode Rejection Ratio (dB) CMRR
Saturation Voltage1 (V)
VSAT1
Saturation Voltage2 (V)
VSAT2
VS=+/-15V, VCM=+/-10V
V+=+4.5V, V-=0V, VCM=0V,
VIN=-6mV, ISINK=3.2mA
VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA
Output Leakage Current (A)
ICEX
VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
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Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH119W High
Performance Dual Comparator.
Pre-Irradiation Specification
Parameter
MIN
MAX
Positive Supply Current (A)
Measurement Precision/Resolution
1.15E-02
Negative Supply Current (A)
-4.50E-03
±4.92E-05
±3.24E-06
Offset Voltage (V)
4.00E-03
±7.43E-06
7.50E-08
±4.93E-10
Positive Input Bias Current (A)
5.00E-07
±3.57E-09
Negative Input Bias Current (A)
5.00E-07
±3.56E-09
Input Offset Current (A)
-7.50E-08
Large Signal Voltage Gain (V/mV)
1.00E+01
±9.10E-01%
Common Mode Rejection Ratio (dB)
9.00E+01
±1.17E+00
Saturation Voltage1 (V)
4.00E-01
±9.97E-04
Saturation Voltage2 (V)
1.50E+00
±4.94E-03
Output Leakage Current (A)
2.00E-06
±1.75E-09
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Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
5.16.
5.17.
5.18.
5.19.
5.20.
Positive Supply Current (A) @ VS=+/-15V, VCM=0V
Negative Supply Current (A) @ VS=+/-15V, VCM=0V
Offset Voltage_1 (V) @ VS=+/-15V, VCM=0V
Offset Voltage_2 (V) @ VS=+/-15V, VCM=0V
Input Offset Current_1 (A) @ VS=+/-15V, VCM=0V
Input Offset Current_2 (A) @ VS=+/-15V, VCM=0V
Positive Input Bias Current_1 (A) @ VS=+/-15V, VCM=0V
Positive Input Bias Current_2 (A) @ VS=+/-15V, VCM=0V
Negative Input Bias Current_1 (A) @ VS=+/-15V, VCM=0V
Negative Input Bias Current_2 (A) @ VS=+/-15V, VCM=0V
Large Signal Voltage Gain_1 (V/mV) @ VS=+/-15V, VCM=0V
Large Signal Voltage Gain_2 (V/mV) @ VS=+/-15V, VCM=0V
Common Mode Rejection Ratio_1 (dB) @ VS=+/-15V, VCM=+/-10V
Common Mode Rejection Ratio_2 (dB) @ VS=+/-15V, VCM=+/-10V
Saturation Voltage1_1 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
Saturation Voltage1_2 (V) @ V+=+4.5V, V-=0V, VCM=0V, VIN=-6mV, ISINK=3.2mA
Saturation Voltage2_1 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA
Saturation Voltage2_2 (V) @ VS=+/-15V, VCM=0V, VIN=-5mV, IO=25mA
Output Leakage Current_1 (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
Output Leakage Current_2 (A) @ VS=+/-15V, VCM=0V, VIN=5mV, VO to V-=35V
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