RH1085 - SPEC NO. 05-08-5105

SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
REVISION RECORD
DESCRIPTION
REV
DATE
0
INITIAL RELEASE
09/16/97
A
•
12/29/97
B
C
D
E
PAGE 4, PARAGRAPH 4.4.2, GROUP B INSPECTION WAS REDEFINED.
PARAGRAPH 4.4.3, GROUP D INSPECTION WAS REDEFINED.
• PAGE 5, PARAGRAPH 4.5, SOURCE INSPECTION WAS REDEFINED.
• PAGE 10, CORRECTED TYPO ON TABLE II, VRLINE PARAMETER.
• PAGE 4, AMENDED PARAGRAPHS 4.1 AND 4.1.1 TAKING EXCEPTION TO ANALYSIS OF
CATASTROPHIC FAILURES.
• PAGE 6, ADDED 0JA OF 35°C/W AND ADDED 0JC OF 3°C/W TO FIGURE 1.
• PAGE 3, PARAGRAPH 3.7, CHANGED VERBIAGE FROM “SPECIFIED IN TABLE III” TO “AND
AS SPECIFIED IN TABLE III HEREIN”, LINE 2.
PARAGRAPH 3.9, ADDED “HEREIN” AFTER “TABLE II” LINE 2.
• PAGE 4, PARAGRAPH 4.3, ADDED “HEREIN” AFTER “TABLE III”, LINE 2.
PARAGRAPH 4.4.1, ADDED “HEREIN” AFTER “TABLE III”, LINE 2.
PARAGRAPH 4.4.2.2, CHANGED VERBIAGE IN LINE 1 FROM “ALL FOOTNOTES OF TABLE
IIA IN MIL-STD-883”.
• PAGE 5, PARAGRAPH 4.4.3.2, CHANGED VERBIAGE IN LINE 1 FROM “ALL FOOTNOTES OF
TABLE IV OF MIL-STD-883” TO “ALL FOOTNOTES PERTAINING TO TABLE IV IN MIL-STD883”.
• PAGE 4:
PARAGRAPH 3.6, TABLE IA CHANGED TO TABLE II.
PARAGRAPH 3.7, TABLE III CHANGED TO TABLE IV.
PARAGRAPH 3.9, TABLE II CHANGED TO TABLE III.
PARAGRAPH 3.11.1 WAS CHANGED “…to an initial rate of rads to 240 rads/sec.
PARAGRAPHS 4.1 THROUGH 4.2 CHANGES WERE DONE TO CLARIFY GROUP SAMPLING.
• PAGE 5:
PARAGRAPHS 4.3 THROUGH 4.4.2.1 CHANGES WERE DONE TO CLARIFY GROUP SAMPLING.
PARAGRAPH 4.4.3 CHANGE WAS DONE TO CLARIFY GROUP SAMPLING.
04/08/98
09/28/99
04/05/00
03/08/05
(SEE NEXT PAGE REVISION CONTINUED)
REVISION RECORD AND DESCRIPTION CONTINUED ON NEXT PAGE.
CAUTION: ELECTROSTATIC DISCHARGE SENSITIVE PART
REVISION
INDEX
REVISION
INDEX
PAGE NO.
REVISION
PAGE NO.
REVISION
APPLICATION
1
K
ORIG
DSGN
ENGR
MFG
CM
QA
PROG
FUNCT
2
K
3
K
4
K
5
K
SIGNOFFS
6
K
7
K
DATE
8
K
9
K
10
K
11
K
12
K
LINEAR TECHNOLOGY CORPORATION
MILPITAS, CALIFORNIA
TITLE:
MICROCIRCUIT, LINEAR,
RH1085M, 3A LOW DROPOUT
POSITIVE ADJUSTABLE REGULATOR
SIZE CAGE CODE DRAWING NUMBER REV
64155
05-08-5105
K
CONTRACT:
FOR OFFICIAL USE ONLY
LINEAR TECHNOLOGY CORPORATION
Page 1 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
REVISION RECORD
DESCRIPTION
REV
DATE
E
• PAGE 6:
PARAGRAPHS 4.6.2 THROUGH 4.6.4 WERE RE-WRITTEN. THESE DATA PROVIDED, AND DATA
AVAILABLE.
PARAGRAPH 4.6.10 NOTE, ADDED FURTHER EXPLANATION OF MINIMUM DELIVERED DATA.
• PAGE 7:
ADDED “SEATING PLANE” TO THE SEATING PLANE DIMENSION OF CASE OUTLINE.
• PAGE 9: BURN-IN CIRCUIT CHANGED FROM “Tj = 170°C AT Ta OF 150°C” TO “Tj = 168°C
MAX AT Ta OF 150°C”.
• PAGES 7 THROUGH 9:
ALL FIGURE TITLES CHANGED TO HAVE DEVICE AND PACKAGE TYPES AT TOP OF PAGE,
AND HAVE ALL FIGURES AT BOTTOM OF PAGE.
03/08/05
F
•
09/10/07
G
• Page 10, Remove note 5 reference to standard datasheet I full load current limit.
• Page 11, Added RH1085 short circuit current limit curve attached.
• Page 4, Paragraph 3.10.3 changed lead material from Alloy 42 to Alloy 52 for TO3
metal can 2 lead. Paragraph 3.11.1 changed verbiage.
10/31/07
PAGE 3, PARAGRAPH 3.1 – REMOVED TEST ON TO3 PACKAGE.
PAGE 5, PARAGRAPH 4.4.2 GROUP B INSPECTION: ADDING (SUBGROUP 1-4 PLUS 6 ARE
PERFORMED ON EVERY ASSEMBLY LOT, AND) TO THE VERBIAGE.
PAGE 9, CHANGED BURN-IN CIRCUIT TO 04-06-0302.
PAGE 10, UPDATED REFERENCE VOLTAGE vs POST-IRRADIATION LIMITS IN TABLE 1A –
ELECTRICAL CHARACTERISTICS. NOTE ADDED RELATED TO TABLES I AND II. NOTES
RENUMBERED ON TABLES I AND II. NEW NOTE IS NOW NOTE 1.
01/12/09
H
J
K
PAGE 5, CHANGED IN BOTH PARAGRAPHS 4.2, 4.3 IN CONJUNCTION TO 3.3 CHANGED TO
3.4 AND PARAGRAPH 4.3 CHANGED 3.1.1 TO 3.1 AND 3.2.1 TO 3.1.1
LINEAR TECHNOLOGY CORPORATION
04/28/08
12/06/10
Page 2 of 12
SPEC NO. 05-08-5105 REV. K
1.0
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
SCOPE:
1.1
This specification defines the performance and test requirements for a microcircuit processed to a space
level manufacturing flow.
2.0
APPLICABLE DOCUMENTS:
2.1
Government Specifications and Standards: the following documents listed in the Department of Defense
Index of Specifications and Standards, of the issue in effect on the date of solicitation, form a part of this
specification to the extent specified herein.
SPECIFICATIONS:
2.2
3.0
MIL-PRF-38535
Integrated Circuits (Microcircuits) Manufacturing, General Specification for
MIL-STD-883
Test Method and Procedures for Microcircuits
MIL-STD-1835
Microcircuits Case Outlines
Order of Precedence: In the event of a conflict between the documents referenced herein and the contents
of this specification, the order of precedence shall be this specification, MIL-PRF-38535 and other
referenced specifications.
REQUIREMENTS:
3.1
General Description: This specification details the requirements for the RH1085M, 3A LOW DROPOUT
POSITIVE ADJUSTABLE REGULATOR, processed to space level manufacturing flow.
3.2
Part Number: RH1085MK
3.3
Part Marking Includes:
3.4
(TO3 METAL CAN, 2 LEAD)
a.
LTC Logo
b.
LTC Part Number (See Paragraph 3.2)
c.
Date Code
d.
Serial Number
e.
ESD Identifier per MIL-PRF-38535, Appendix A
The Absolute Maximum Ratings:
LINEAR TECHNOLOGY CORPORATION
Page 3 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
Power Dissipation
. . . .
Input to Output Voltage Differential
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
Internally Limited
. 30V
Operating Junction Temperature Range
Control circuitry . . . . .
Power transistor . . . . .
. . . . .
Storage Temperature Range
. . .
Lead Temperature (Soldering, 10 sec)
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
.
-55°C to +150°C
-55°C to +200°C
-65°C to +150°C
+300°C
3.5
Electrostatic discharge sensitivity, ESDS, shall be Class 1.
3.6
Electrical Performance Characteristics: The electrical performance characteristics shall be as specified in
Table I and Table II.
3.7
Electrical Test Requirements: Screening requirements shall be in accordance with 4.1 herein,
MIL-STD-883, Method 5004, and as specified in Table IV herein.
3.8
Burn-In Requirement: Burn-in circuit is specified in Figure 4.
3.9
Delta Limit Requirement: Delta limit parameters are specified in Table III herein, are calculated after
each burn-in, and the delta rejects are included in the PDA calculation.
3.10
Design, Construction, and Physical Dimensions: Detail design, construction, physical dimensions, and
electrical requirements shall be specified herein.
3.11
4.0
.
3.10.1
Mechanical / Packaging Requirements: Case outlines and dimensions are in accordance with
Figure 1.
3.10.2
Terminal Connections: The terminal connections shall be as specified in Figure 2.
3.10.3
Lead Material and Finish: The lead material and finish for Device shall be Alloy 52 with hot
solder dip (Finish letter A) in accordance with MIL-PRF-38535.
Radiation Hardness Assurance (RHA):
3.11.1
The manufacturer shall perform a lot sample test as an internal process monitor for total dose
radiation tolerance. The sample test is performed with MIL-STD-883 TM1019 Condition A as
a guideline.
3.11.2
For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation,
the manufacturer will provide certified RAD testing and report through an independent test
laboratory when required as a customer purchase order line item.
3.11.3
Total dose bias circuit is specified in Figure 3.
3.12
Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A,
except for the following: Topside glassivation thickness shall be a minimum of 4KÅ.
3.13
Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method 2018 and copies of SEM
photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when
specified as a customer purchase order line item.
VERIFICATION (QUALITY ASSURANCE PROVISIONS)
LINEAR TECHNOLOGY CORPORATION
Page 4 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
4.1
Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF38535. Linear Technology is a QML certified company and all Rad Hard candidates are assembled on
qualified Class S manufacturing lines.
4.2
Sampling and Inspection: Sampling and Inspection shall be in accordance with MIL-STD-883, Method
5005 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1.1, 3.2.1, and
3.4 of the test method.
4.3
Screening: Screening requirements shall be in accordance with MIL-STD-883, Method 5004 with QML
allowed and TRB approved deviations in conjunction with paragraphs 3.1, 3.1.1, and 3.4 of the test
method. Electrical testing shall be as specified in Table IV herein.
4.3.1
4.4
Analysis of catastrophic (open/short) failures from burn-in will be conducted only when a lot fails
the burn-in or re-burn-in PDA requirements.
Quality Conformance Inspection: Quality conformance inspection shall be in accordance with 4.2 and 4.3
herein and as follows:
4.4.1
Group A Inspection: Group A inspection shall be performed in accordance with 4.1 herein, per
MIL-STD-883, Method 5005, and specified in Table IV herein.
4.4.2
Group B Inspection: When purchased, a full Group B is performed on an inspection lot. As a
minimum, Subgroups 1-4 plus 6 are performed on every assembly lot, and Subgroup B2
(Resistance to Solvents / Mark Permanency) and Subgroup B3 (Solderability) are performed prior
to the first shipment from any inspection lot and Attributes provided when a Full Space Data Pack
is ordered. Subgroup B5 (Operating Life) is performed on each wafer lot. This subgroup may or
may not be from devices built in the same package style as the current inspection lot. Attributes
and variables data for this subgroup will be provided upon request at no charge.
4.4.2.1
Group B, Subgroup 2c = 10%
Group B, Subgroup 3 = 10%
Group B, Subgroup 5 = *5%
(*per wafer or inspection lot
whichever is the larger quantity)
Group B, Subgroup 4 = 5%
Group B, subgroup 6 = 15%
4.4.2.2 All footnotes pertaining to Table IIa in MIL-STD-883, Method 5005 apply. The
quantity (accept number) of all other subgroups are per MIL-STD-883, Method 5005, Table IIa.
4.4.3
Group D Inspection: When purchased, a full Group D is performed on an inspection lot. As a
minimum, periodic full Group D sampling is performed on each package family for each
assembly location every 26 weeks. A generic Group D Summary is provided when a full Space
Data Pack is ordered.
4.4.3.1
Group D, Subgroups 3, 4 and 5 = 15% each (Sample Size Series).
4.4.3.2
All footnotes pertaining to Table IV in MIL-STD-883, Method 5005 apply. The
quantity (accept number) or sample number and accept number of all other subgroups
are per MIL-STD-883, Method 5005, Table IV.
LINEAR TECHNOLOGY CORPORATION
Page 5 of 12
SPEC NO. 05-08-5105 REV. K
4.5
4.6
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
Source Inspection:
4.5.1
The manufacturer will coordinate Source Inspection at wafer lot acceptance and pre-seal internal
visual.
4.5.2
The procuring activity has the right to perform source inspection at the supplier’s facility prior to
shipment for each lot of deliverables when specified as a customer purchase order line item. This
may include wafer lot acceptance and final data review.
Deliverable Data: Deliverable data that will ship with devices when a Space Data Pack is ordered:
4.6.1
Lot Serial Number Sheets identifying all devices accepted through final inspection by serial
number.
4.6.2
100% attributes (completed lot specific traveler; includes Group A Summary)
4.6.3
Burn-In Variables Data and Deltas (if applicable)
4.6.4
Group B2, B3, and B5 Attributes (Variables data, if performed on lot shipping)
4.6.5
Generic Group D data (4.4.3 herein)
4.6.6
SEM photographs (3.13 herein)
4.6.7
Wafer Lot Acceptance Report (3.13 herein)
4.6.8
X-Ray Negatives and Radiographic Report
4.6.9
A copy of outside test laboratory radiation report if ordered
4.6.10 Certificate of Conformance certifying that the devices meet all the requirements of this
specification and have successfully completed the mandatory tests and inspections herein.
Note: Items 4.6.1 and 4.6.10 will be delivered as a minimum, with each shipment. This is
noted on the Purchase Order Review Form as “No Charge Data”.
5.0
Packaging Requirements: Packaging shall be in accordance with Appendix A of MIL-PRF-38535. All devices
shall be packaged in conductive material or packaged in anti-static material with an external conductive field
shielding barrier.
LINEAR TECHNOLOGY CORPORATION
Page 6 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
(K) TO3 / 2 LEADS CASE OUTLINE
θja = 35°C/W
θjc = 3°C/W
FIGURE 1
LINEAR TECHNOLOGY CORPORATION
Page 7 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
TERMINAL CONNECTIONS
FIGURE 2
TOTAL DOSE BIAS CIRCUIT
FIGURE 3
LINEAR TECHNOLOGY CORPORATION
Page 8 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
STATIC BURN-IN CIRCUIT
TO3 METAL CAN / 2 LEADS
FIGURE 4
LINEAR TECHNOLOGY CORPORATION
Page 9 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
TABLE I: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION)
SEE NOTES ON NEXT PAGE.
LINEAR TECHNOLOGY CORPORATION
Page 10 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
TABLE II ELECTRICAL CHARACTERISTICS (POST-IRRADIATION
TA = 25°C, UNLESS OTHERWISE NOTED
LINEAR TECHNOLOGY CORPORATION
Page 11 of 12
SPEC NO. 05-08-5105 REV. K
RH1085M, 3A LOW DROPOUT POSITIVE ADJUSTABLE REGULATOR
TABLE III: POST BURN-IN ENDPOINTS AND DELTA LIMIT REQUIREMENTS
TA = 25°C, (VIN - VOUT) = 3V IOUT = 10mA
PARAMETER
VREF
+IADJ
VRLINE
ENDPOINT LIMIT
MIN
MAX
1. 238
1. 262
15
120
-0. 2
0. 2
DELTA
MIN
-0. 01
-10
MAX
0. 01
10
-0. 1
0. 1
UNITS
V
μA
%
TABLE IV: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUP
FINAL ELECTRICAL TEST REQUIREMENTS (METHOD 5004)
1*, 2, 3,4,5,6
GROUP A TEST REQUIREMENTS (METHOD 5005)
1, 2, 3,4,5,6
GROUP B AND D FOR CLASS S ENDPOINT ELECTRICAL PARAMETERS (METHOD 5005)
1, 2, 3
*PDA APPLIES TO SUBGROUP 1.
PDA TEST NOTE: The PDA is specified as 5% based on failures from Group A, Subgroup 1, tests after cooldown as the final
electrical test in accordance with method 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1 and delta rejects after
burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine the percent for the lot.
LINEAR TECHNOLOGY CORPORATION
Page 12 of 12