-1- FINAL PRODUCT/PROCESS CHANGE NOTIFICATION Generic Copy 30-SEP-2003 SUBJECT: ON Semiconductor Final Product/Process Change Notification #13135 TITLE: Phase#1 Die Design Change (Die Shrink) for Bipolar Power Products EFFECTIVE DATE: 01-Dec-2003 AFFECTED CHANGE CATEGORY: Design Change AFFECTED PRODUCT DIVISION: Bipolar Discretes Products Div ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Dianne Von Borstel <[email protected]> FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact Sales Office or Jose Ramirez <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. FPCNs are issued at least 60 days prior to implementation of the change. ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact your local ON Semiconductor Sales Office. DESCRIPTION AND PURPOSE: This is the Final Notification for Phase#1 of IPCN#12868 located at www.onsemi.com. ON Semiconductor wishes to notify customers that the listed Bipolar Power Transistor devices have received an active area die size reduction. Electrical characterization and qualification data have been completed. Device parametric specifications and ratings have not changed. Samples are available upon request. ON Seminconductor continues to make substantial investments in both new technologies and improved manufacturing capabilities to provide you the highest quality and reliability in the semiconductor industry. Issue Date: 30 Sep, 2003 Page 1 of 4 -2- Final Product/Process Change Notification #13135 RELIABILITY DATA SUMMARY: TEST MJE15032 Lot A Lot B Lot C HTRB 0/77 0/77 0/77 H3TRB 0/77 0/77 0/77 IOL 0/77 0/77 0/77 TC 0/77 0/77 0/77 AC 0/77 0/77 0/77 ESD(MM) >400V >400V >400V TEST HTRB H3TRB IOL TC AC ESD(MM) Lot A 0/77 0/77 0/77 0/77 0/77 >400V TEST HTRB H3TRB IOL TC AC ESD(MM) Control 0/77 0/77 0/77 0/77 0/77 >400V MJE340 Lot B Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 >400V >400V MJE182 Lot A 0/77 0/77 0/77 0/77 0/77 >400V Lot A 0/77 0/77 0/77 0/77 0/77 >400V Lot A 0/77 0/77 0/77 0/77 0/77 >400V MJE15033 Lot B Lot C 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 >400V >400V Control 0/77 0/77 0/77 0/77 0/77 >400V MJE350 Lot B Control 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 0/77 >400V >400V MJE253T4 Lot A 0/77 0/77 0/77 0/77 0/77 >400V ELECTRICAL CHARACTERISTIC SUMMARY: TEST Cond. Limit Unit Stat Iebo Veb=5V <10uA uA Avg/Sd Icbo Vcb=250V <10uA uA Avg/Sd Iceo Vce=255V <1mA uA Avg/Sd hFE 0.5A/5V >50 Avg/Sd hFE 1A/5V >50 Avg/Sd hFE 2A/5V >10 Avg/Sd VCE 1A/0.1A <0.5V mVolt Avg/Sd (sat) VBE 1A/2V <1.0V mVolt Avg/Sd (on) TEST Cond. Limit Unit Iebo Veb=5V <10uA nA Icbo Vcb=250V <10uA nA Iceo Vce=255V <1mA uA hFE 0.5A/5V >50 hFE 1A/5V >50 hFE 2A/5V >10 VCE 1A/0.1A <0.5V mVolt (sat) VBE 1A/2V <1.0V mVolt (on) Issue Date: 30 Sep, 2003 Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Lot A 0.36/0.46 11.3/1.9 4.6/2.6 100.1/13.4 99.9/13.2 84.5/10 86.3/1.7 MJE15032 Lot B Lot C 0.25/0.02 0.60/1.4 10.7/0.2 12.1/5.1 3.7/2.9 5.3/2.9 97.4/18.5 105.8/18.3 97.3/18.3 105.9/18.2 83.0/13.8 90.2/13.8 84.5/1.9 84.8/2.0 Control 0.50/0.7 10.9/0.3 5.3/6.5 150.9/31.3 151.0/31.0 122.4/20.7 76.9/1.6 758/4.6 759/6.3 729/6.0 Lot A 0.27/0.18 12.1/0.91 0.35/0.08 121.6/3.3 114.3/2.9 61.8/1.4 150.0/3.1 MJE15033 Lot B Lot C 0.31/0.18 0.19/0.14 15.9/2.17 11.7/0.35 0.35/0.14 0.26/0.12 124.2/2.8 125.6/3.2 116.3/2.7 117.9/2.9 60.8/3.8 67.6/3.6 160.8/4.2 155.7/5.5 Avg/Sd 758.0/0.57 753/6.3 Control 0.15/0.19 13.4/0.49 0.450/0.39 138.2/4.7 129.6/4.1 70.4/1.2 138.1/3.0 757.6/1.68 755.8/1.69 738.3/1.06 Page 2 of 4 -3- Final Product/Process Change Notification #13135 MJE340 Lot A Control 106/71 91/39 0.42/0.20 0.53/0.2 413.4/31.3 410.8/10.8 485.6/4.3 492.6/4.5 160.7/61.3 121.7/21.6 MJE350 Lot A Control 97.2/35.3 131/34.1 1.17/0.31 1.88/0.99 431.2/3.8 405.9/2.2 496.8/4.3 477.8/3.2 127.9/4.9 116.1/1.6 TEST Iebo Icbo BVceo BVcbo hFE Cond. Veb=5V Vcb=300V Ic=1mA Ic=100uA 50mA/10V Limit <100uA <100uA >300V >300V 40 - 240 Unit pA nA Vlts Vlts Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd TEST Iebo Icbo BVceo BVceo hFE hFE hFE hFE hFE Vce (sat) Vce (sat) Vce (sat) Vbe (sat) Vbe (sat) Vbe (on) Cond. Limit Veb=5V <100nA Vcb=100V <100nA Ic=10mA >80V Ic=10mA >100V 0.1A/1V 50 - 250 0.2A/1V 40 - 180 0.5A/1V >30 1A/1V >15 1.5A/1V >12 0.5A/50mA <0.3V Unit pA nA Vlts Vlts Vlts Stat Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd Avg/Sd 1A/0.1A <0.6A Vlts Avg/Sd 1.5A/0.15A <0.9V Vlts Avg/Sd .249/.006 .212/.007 1.5A/0.15A <1.5V Vlts Avg/Sd .997/.005 .947/.007 2A/0.2A <1.8V Vlts Avg/Sd 0.5A/1V <1.2V Vlts Avg/Sd .807/.005 .800/.009 .828/.003 MJE182 MJD253T4 Lot A Control Lot A Control 79.7/165 446/280 43/24 48/35 0.13/0.08 0.27/0.12 0.24/0.04 0.37/0.07 97.8/0.5 126.8/5.7 165.2/14.5 161.9/4.5 117.2/11.2 100.4/24.3 111.9/1.9 122.9/1.3 97.5/9.4 78.3/16.4 51.1/4.5 .095/.003 28.6/5.8 78.3/16.4 .095/.005 .202/.003 .177/.004 .348/0.01 .297/.006 25.7/1.4 1.180/.011 1.092/.002 .805/.002 CHANGED PART IDENTIFICATION: Product marked with date code 0348 and newer may have new die design. AFFECTED DEVICE LIST (WITHOUT SPECIALS): PART 2N5655 2N5657 BD135 BD136 BD137 BD138 BD139 BD140 BD159 BD787 BD788 BU406 BU407 BUV26 BUV27 Issue Date: 30 Sep, 2003 Page 3 of 4 -4- Final Product/Process Change Notification #13135 D44H11 D44H8 D44VH10 D45H11 D45H8 D45VH10 MJB44H11 MJB44H11T4 MJB45H11 MJB45H11T4 MJD200 MJD200RL MJD200T4 MJD210 MJD210RL MJD210T4 MJD243 MJD243T4 MJD253T4 MJD340 MJD340RL MJD340T4 MJD350 MJD350T4 MJE15028 MJE15029 MJE15030 MJE15031 MJE15032 MJE15033 MJE170 MJE171 MJE172 MJE180 MJE181 MJE182 MJE200 MJE210 MJE210T MJE243 MJE253 MJE340 MJE3439 MJE344 MJE350 MJEC15030WP MJEC15031WP MJEC340WP MJEC350WP MJEC44H11WP MJF15030 MJF15031 MJF44H11 MJF45H11 MMJT350T1 SJE2894 Issue Date: 30 Sep, 2003 Page 4 of 4