SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER REVISION RECORD DESCRIPTION REV DATE 0 A INITIAL RELEASE • PAGE 3, CHANGED INITIAL RATE OF RADS TO 240 RADS/SEC 01/05/05 03/15/05 B • 01/09/08 C • PAGE 4, CHANGED IN BOTH PARAGRAPHS 4.2, 4.3 IN CONJUNCTION TO 3.3 CHANGED TO 3.4 AND PARAGRAPH 4.3 CHANGED 3.1.1 TO 3.1 AND 3.2.1 TO 3.1.1 PAGE 3, PARAGRAPH 3.11.1 CHANGED VERBIAGE. • PAGE 10, TABLE II: CHANGED VOS 50K RAD(Si), MAX FROM 2.5 mV TO 4 mV; CHANGED VOS 100K RAD (Si), MAX FROM 3 mV TO 4 mV. 05/03/10 • PAGE 12, TABLE IV: CHANGED VOS 50K RAD (Si), MAX FROM 3nA TO 4.5 nA; CHANGED VOS 100K RAD (Si), CHANGED MAX FROM 3.5 nA TO 4.5 nA; D 05/05/08 CHANGED CMRR 50K RAD (Si) MIN FROM 69dB TO 60 dB; CHANGED CMRR 100K RAD (Si) MIN FROM 66 dB TO 60 dB; CHANGED CMRR 200K RAD (Si) MIN FROM 63 dB TO 60 dB; CHANGED PSRR 50K RAD (Si) MIN FROM 72dB TO 65 dB; CHANGED PSRR 100K RAD (Si) MIN FROM 70 dB TO 65 dB; CHANGED PSRR 200K RAD (Si) MIN FROM 68 dB TO 65 dB; E • PAGE 10, TABLE II: DELETED “NOTE 7” FROM HEADER. PAGE 11, TABLE III AND 12, TABLE IV HAD CORRECTION TO VCM FROM 0V TO 2.5V. 06/13/11 CAUTION: ELECTROSTATIC DISCHARGE SENSITIVE PART REVISION INDEX REVISION INDEX PAGE NO. REVISION PAGE NO. REVISION 1 E 2 E 3 E 4 E 5 E 6 E 7 E ORIG DSGN ENGR MFG CM QA PROG FUNCT APPLICATION SIGNOFFS DATE 8 E 9 E 10 E 11 E 12 E 13 E LINEAR TECHNOLOGY CORPORATION MILPITAS, CALIFORNIA TITLE: MICROCIRCUIT, LINEAR, RH1814M, QUAD OPERATIONAL AMPLIFIER SIZE CAGE DRAWING CODE NUMBER REV 64155 05-08-5204 E CONTRACT: FOR OFFICIAL USE ONLY LINEAR TECHNOLOGY CORPORATION PAGE 1 OF 13 SPEC NO. 05-08-5204 REV. E 1.0 SCOPE: 1.1 2.0 RH1814M, QUAD OPERATIONAL AMPLIFIER This specification defines the performance and test requirements for a microcircuit processed to a space level manufacturing flow. APPLICABLE DOCUMENTS: 2.1 Government Specifications and Standards: the following documents listed in the Department of Defense Index of Specifications and Standards, of the issue in effect on the date of solicitation, form a part of this specification to the extent specified herein. SPECIFICATIONS: 2.2 3.0 MIL-PRF-38535 Integrated Circuits (Microcircuits) Manufacturing, General Specification for MIL-STD-883 Test Method and Procedures for Microcircuits MIL-STD-1835 Microcircuits Case Outlines Order of Precedence: In the event of a conflict between the documents referenced herein and the contents of this specification, the order of precedence shall be this specification, MIL-PRF-38535 and other referenced specifications. REQUIREMENTS: 3.1 General Description: This specification details the requirements for the RH1814, Operational Amplifier, processed to space level manufacturing flow. 3.2 Part Number: 3.2.1 3.3 RH1814MW (FLATPACK, GLASS SEAL, 14 LEAD) Part Marking Includes: 3.3.1 LTC Logo 3.3.2 LTC Part Number (See Paragraph 3.2) 3.3.3 Date Code 3.3.4 Serial Number 3.3.5 ESD Identifier per MIL-PRF-38535, Appendix A LINEAR TECHNOLOGY CORPORATION PAGE 2 OF 13 SPEC NO. 05-08-5204 REV. E 3.4 The Absolute Maximum Ratings: (NOTE 1) Supply Voltage . . . . . . . Differential Input Voltage (Note 2) . . . . . . . Input Voltage Output Short Circuit Duration (Note 3) Operating Temperature Range . . . . . Storage Temperature Range Lead Temperature (Soldering, 10 sec.) RH1814M, QUAD OPERATIONAL AMPLIFIER . . . . . . . . . 12.6V . . . . . . . . . +6V . . . . . . . . . +Vs . . . . . . . . . Indefinite . . . . . . . . . -55°C to 125°C . . . . . . . . . -65°C to 150°C . . . . . . . . . 300°C Note 1: Absolute Maximum Ratings are those values beyond which the life of the device may be impaired. Note 2: Differential inputs of +6V are appropriate for transient operation only. such as during slewing. Large sustained differential inputs can cause excessive power dissipation and may damage the part. Note 3: A heat sink may be required to keep the junction temperature below absolute maximum when the output is shorted indefinitely. 3.5 Electrostatic discharge sensitivity, ESDS, shall be Class 2. 3.6 Electrical Performance Characteristics: The electrical performance characteristics shall be as specified in Table I, Table II, Table III, and Table IV. 3.7 Electrical Test Requirements: Screening requirements shall be in accordance with 4.1 herein, MIL-STD-883, Method 5004, and as specified in Table V herein. 3.8 Burn-In Requirement: 3.8.1 (Glass Sealed Flatpack) : Static Burn-In, Figure 3. 3.9 Delta Limit Requirement: Delta limit parameters are specified in Table V herein, are calculated after each burn-in, and the delta rejects are included in the PDA calculation. 3.10 Design, Construction, and Physical Dimensions: Detail design, construction, physical dimensions, and electrical requirements shall be specified herein. 3.11 3.10.1 Mechanical / Packaging Requirements: Case outlines and dimensions are in accordance with Figure 1(Glass Sealed Flatpack/14 Leads). 3.10.2 Terminal Connections: The terminal connections shall be as specified in Figure 2 (Glass Sealed Flatpack/14 Leads). 3.10.3 Lead Material and Finish: The lead material shall be Alloy 42 for Flatpack. The lead finish shall be hot solder dip (Finish letter A) in accordance with MIL-PRF-38535. Radiation Hardness Assurance (RHA): 3.11.1 The manufacturer shall perform a lot sample test as an internal process monitor for total dose radiation tolerance. The sample test is performed with MIL-STD-883 TM1019 Condition A as a guideline. LINEAR TECHNOLOGY CORPORATION PAGE 3 OF 13 SPEC NO. 05-08-5204 REV. E 4.0 RH1814M, QUAD OPERATIONAL AMPLIFIER 3.11.2 For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation, the manufacturer will provide certified RAD testing and report through an independent test laboratory when required as a customer purchase order line item. 3.11.3 Total dose bias circuit is specified in Figure 4. 3.12 Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A, except for the following: Topside glassivation thickness shall be a minimum of 4KÅ. 3.13 Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method 2018 and copies of SEM photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when specified as a customer purchase order line item. VERIFICATION (QUALITY ASSURANCE PROVISIONS) 4.1 Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF-38535. Linear Technology is a QML certified company and all Rad Hard candidates are assembled on qualified Class S manufacturing lines. 4.2 Sampling and Inspection: Sampling and Inspection shall be in accordance with MIL-STD-883, Method 5005 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1.1, 3.2.1, and 3.4 of the test method. 4.3 Screening: Screening requirements shall be in accordance with MIL-STD-883, Method 5004 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1, 3.1.1, and 3.4 of the test method. Electrical testing shall be as specified in Table VI herein. 4.3.1 4.4 Analysis of catastrophic (open/short) failures from burn-in will be conducted only when a lot fails the burn-in or re-burn-in PDA requirements. Quality Conformance Inspection: Quality conformance inspection shall be in accordance with 4.2 and 4.3 herein and as follows: 4.4.1 Group A Inspection: Group A inspection shall be performed in accordance with 4.1 herein, per MIL-STD-883, Method 5005, and specified in Table VI herein. 4.4.2 Group B Inspection: When purchased, a full Group B is performed on an inspection lot. As a minimum, Subgroup B2 (Resistance to Solvents / Mark Permanency) and Subgroup B3 (Solderability) are performed prior to the first shipment from any inspection lot and Attributes provided when a Full Space Data Pack is ordered. Subgroup B5 (Operating Life) is performed on each wafer lot. This subgroup may or may not be from devices built in the same package style as the current inspection lot. Attributes and variables data for this subgroup will be provided upon request at no charge. 4.4.2.1 Group B, Subgroup 2c = 10% Group B, Subgroup 3 = 10% Group B, Subgroup 5 = *5% (*per wafer or inspection lot whichever is the larger quantity) Group B, Subgroup 4 = 5% Group B, Subgroup 6 = 15% 4.4.2.2 All footnotes pertaining to Table IIa in MIL-STD-883, Method 5005 apply. The quantity (accept number) of all other subgroups are per MIL-STD-883, Method 5005, Table IIa. LINEAR TECHNOLOGY CORPORATION PAGE 4 OF 13 SPEC NO. 05-08-5204 REV. E 4.4.3 4.5 4.6 RH1814M, QUAD OPERATIONAL AMPLIFIER Group D Inspection: When purchased, a full Group D is performed on an inspection lot. As a minimum, periodic full Group D sampling is performed on each package family for each assembly location every 26 weeks. A generic Group D Summary is provided when a full Space Data Pack is ordered. 4.4.3.1 Group D, Subgroups 3, 4 and 5 = 15% each (Sample Size Series). 4.4.3.2 All footnotes pertaining to Table IV in MIL-STD-883, Method 5005 apply. The quantity (accept number) or sample number and accept number of all other subgroups are per MIL-STD-883, Method 5005, Table IV. Source Inspection: 4.5.1 The manufacturer will coordinate Source Inspection at wafer lot acceptance and pre-seal internal visual. 4.5.2 The procuring activity has the right to perform source inspection at the supplier’s facility prior to shipment for each lot of deliverables when specified as a customer purchase order line item. This may include wafer lot acceptance and final data review. Deliverable Data: Deliverable data that will ship with devices when a Space Data Pack is ordered: 4.6.1 Lot Serial Number Sheets identifying all devices accepted through final inspection by serial number. 4.6.2 100% attributes (completed lot specific traveler; includes Group A Summary) 4.6.3 Burn-In Variables Data and Deltas (if applicable) 4.6.4 Group B2, B3, and B5 Attributes (Variables data, if performed on lot shipping) 4.6.5 Generic Group D data (4.4.3 herein) 4.6.6 SEM photographs (3.13 herein) 4.6.7 Wafer Lot Acceptance Report (3.13 herein) 4.6.8 X-Ray Negatives and Radiographic Report 4.6.9 A copy of outside test laboratory radiation report if ordered 4.6.10 Certificate of Conformance certifying that the devices meet all the requirements of this specification and have successfully completed the mandatory tests and inspections herein. Note: Items 4.6.1 and 4.6.10 will be delivered as a minimum, with each shipment. This is noted on the Purchase Order Review Form as “No Charge Data”. 5.0 Packaging Requirements: Packaging shall be in accordance with Appendix A of MIL-PRF-38535. All devices shall be packaged in conductive material or packaged in anti-static material with an external conductive field shielding barrier. LINEAR TECHNOLOGY CORPORATION PAGE 5 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER W PACKAGE 14-LEAD FLATPAK GLASS SEALED (HERMETIC) (REFERENCE LTC DWG # 05-08-1140) NOTE: 1. THIS DIMENSION ALLOWS FOR OFF-CENTER LID, MENISCUS AND GLASS OVER RUN. NOTE: 2. INCREASE DIMENSION BY 0.003 INCH WHEN LEAD FINISH IS APPLIED (SOLDER DIPPED). θja = +160°C/W θjc = +40°C/W FIGURE 1 LINEAR TECHNOLOGY CORPORATION PAGE 6 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER GLASS SEALED FLATPACK / 14 LEADS FIGURE 2 LINEAR TECHNOLOGY CORPORATION PAGE 7 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER STATIC BURN-IN CIRCUIT FLATPACK, GLASS SEAL / 14 LEADS FIGURE 3 LINEAR TECHNOLOGY CORPORATION PAGE 8 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER TOTAL DOSE BIAS CIRCUIT FIGURE 4 LINEAR TECHNOLOGY CORPORATION PAGE 9 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER TABLE I: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION) TABLE II: ELECTRICAL CHARACTERISTICS (POST-IRRADIATION) Notes are on page 12 following the post irradiation table IV LINEAR TECHNOLOGY CORPORATION PAGE 10 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER TABLE III: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION) VS = 5V, 0V, VCM = 2.5V, unless otherwise noted. Notes are on page 12 following the post irradiation table IV LINEAR TECHNOLOGY CORPORATION PAGE 11 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER TABLE IV: ELECTRICAL CHARACTERISTICS (POST-IRRADIATION) VS = 5V, 0V, VCM = 2.5V, T A = 25°C, unless otherwise noted. LINEAR TECHNOLOGY CORPORATION PAGE 12 OF 13 SPEC NO. 05-08-5204 REV. E RH1814M, QUAD OPERATIONAL AMPLIFIER TABLE V: POST BURN-IN ENDPOINTS AND DELTA LIMIT REQUIREMENTS TA = 25°C, VS = +5V, VCM = 0V unless otherwise noted ENDPOINT LIMIT MIN MAX MIN MAX UNITS Vos -1.5 +1.5 -0.5 +0.5 mV +IB -4 +4 -1.5 +1.5 µA -IB -4 +4 -1.5 +1.5 µA PARAMETER DELTA TABLE VI: ELECTRICAL TEST REQUIREMENTS LINEAR TECHNOLOGY CORPORATION PAGE 13 OF 13