ELDRS Report RH1014MW_Fab Lot W10722836.1.pdf

ELDRS Report
08-199 090408 R1.2
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1014MW Quad Operational Amplifier for Linear Technology
Customer: Linear Technology (PO 50546L)
RAD Job Number: 08-199
Part Type Tested: Linear Technology RH1014MW Quad Operational Amplifier
Commercial Part Number: RH1014MW
Traceability Information: Lot Date Code: 0737A, Fab Run # W10722836.1, W04, Assy Lot #446548.1
Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit.
External Traveler: None required
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD, Inc.
TID Dose Rate and Maximum Total Dose: 10mrad(Si)/s to 50krad(Si) total ionizing dose
TID Test Increments: Pre-Irradiation, 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si)
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168-hour
100°C anneal. Both anneals were performed in the same electrical bias condition as the irradiations. Electrical
measurements were made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Hardware and Test Program: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1014 DUT Board (BGSS970312B), RH1014L3.SRC
TID Bias Conditions: Serial numbers 1027, 1029, 1030, 1031 and 1032 were biased during irradiation, serial numbers
1033, 1034, 1035, 1036, and 1038 were unbiased during irradiation and serial number 1039 was used as the control.
Facility: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO
Radiation Sources: Co60 (Gamma Beam 150)
Irradiation and Test Temperature: Ambient, room temperature controlled to 24°C ± 6°C
ELDRS Test Result: PASSED. All parts met datasheet specifications to
50krad(Si) with no substantial degradation to any measured parameter
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ELDRS Report
08-199 090408 R1.2
Radiation Assured Devices
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(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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ELDRS Report
08-199 090408 R1.2
Radiation Assured Devices
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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ELDRS Report
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3.0.
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Test Conditions
The RH1014MW quad operational amplifier described in this final report was tested using two bias
conditions, statically biased with a split 15V supply and all pins tied to ground, see Appendix A for
details on biasing conditions. These devices were irradiated to a maximum total ionizing dose level of
50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within
one hour following the end of each irradiation segment. For intermediate irradiations, the units were
tested and returned to total dose exposure within two hours from the end of the previous radiation
increment. The ELDRS bias board was positioned in the Co-60 cell to provide the required
10mrad(Si)/s and was located inside a lead-aluminum box. The lead-aluminum box is required under
MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10.0mrad(Si)/s with a precision of ±5%.
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ELDRS Report
08-199 090408 R1.2
4.0.
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Tested Parameters
The following parameters were tested during the course of this work:
1. Positive Supply Current (ICC+)
2. Negative Supply Current (IEE-)
3. Input Offset Voltage (VOS1-VOS4)
4. Input Offset Current (IOS1-IOS4)
5. + Input Bias Current (IB+1-IB+4)
6. - Input Bias Current (IB-1-IB-4)
7. Common Mode Rejection Ratio (CMRR1-CMRR4)
8. Power Supply Rejection Ratio (PSRR1-PSRR4)
9. Large Signal Voltage Gain (AVOL9-AVOL12)
10. Positive Output Voltage Swing (VOUT+1-VOUT+4)
11. Negative Output Voltage Swing (VOUT-1-VOUT-4)
12. Positive Slew Rate (SlewRate+1-SlewRate+4)
13. Negative Slew Rate (SlewRate-1-SlewRate-4)
14. Positive Supply Current (ICC+2)
15. Negative Supply Current (IEE-2)
16. Input Offset Voltage (VOS5-VOS8)
17. Input Offset Current (IOS5-IOS8)
18. + Input Bias Current (IB+5-IB+8)
19. - Input Bias Current (IB-5-IB-8)
20. Positive Output Voltage Swing (VOUT+5-VOUT+8)
21. Positive Output Voltage Swing (VOUT+9-VOUT+12)
22. Negative Output Voltage Swing (VOUT-5-VOUT-8)
23. Negative Output Voltage Swing (VOUT-9-VOUT-12)
24. Negative Output Voltage Swing (VOUT-13-VOUT-16)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement
resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are
contained in this report as well as in a separate Excel file. The attributes data contains the average, standard
deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814
using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of
confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent
defective (LTPD) approach. Note that the following criteria must be met for a device to pass the ELDRS
testing: following the radiation exposure the unit shall pass the specification value and the average value for
the each device must pass the specification value when the KTL limits are applied. If either of these
conditions is not satisfied following the radiation exposure, then the lot could be logged as an RLAT failure.
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ELDRS Report
08-199 090408 R1.2
Radiation Assured Devices
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Colorado Springs, CO 80919
(719) 531-0800
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits
ELDRS” states the following: Select a minimum random sample of 21 devices from a population
representative of recent production runs. Smaller sample sizes may be used if agreed upon between the
parties to the test. All of the selected devices shall have undergone appropriate elevated temperature
reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5
each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts
assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5
under the irradiation bias given in the acquisition specification at 50-300 rad(Si)/s and room temperature.
Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition
specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels,
including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on
each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10
where the low dose rate test is considered Condition D. Calculate the radiation induced change in each
electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara
at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level.
If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS
susceptible. This test does not apply to parameters which exhibit changes that are within experimental error
or whose values are below the pre-irradiation electrical specification limits at low dose rate at the
specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled “Radiation Lot
Acceptance Testing (RLAT) of the RH1014MW Quad Operational Amplifier for Linear Technology” to
demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1014MW devices passed the ELDRS test to 50krad(Si) with
no significant degradation to most of the measured parameters. Where radiation induced degradation
was observed the degradation was not sufficient to cause the parameter to exceed the specification value.
Figures 5.1 through 5.84 show plots of all the measured parameters versus total ionizing dose. In the
data plots the solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
08-199 090408 R1.2
Radiation Assured Devices
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(719) 531-0800
Tables 5.1 through 5.84 show the raw data, averages, standard deviation, +KTL statistics, -KTL
statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of
all the figures in this results section to facilitate the location of a particular parameter.
As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the
specification even after application of the KTL statistics (with certain exceptions, as noted below). The
control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained under control during the course of the testing.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. The parameters measured in this report where the preirradiation KTL values are out of specification include Common Mode Rejection Ratio, Power Supply
Rejection Ratio and Open Loop Gain, where the device exhibits extreme sensitivity to input conditions,
resulting in a very large standard deviation and a statistical error often greater than the measured value.
If necessary, larger samples sizes could be used to qualify these parameters using an “attributes”
approach.
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ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Positive Supply Current @ +/-15V (A)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
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ELDRS Report
08-199 090408 R1.2
Table 5.1. Raw data for Positive Supply Current @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Supply Current @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.56E-03
1.48E-03
1.51E-03
1.50E-03
1.50E-03
1.49E-03
1.58E-03
1.52E-03
1.52E-03
1.50E-03
1.55E-03
10
1.55E-03
1.47E-03
1.50E-03
1.50E-03
1.50E-03
1.53E-03
1.63E-03
1.57E-03
1.56E-03
1.54E-03
1.56E-03
20
1.55E-03
1.48E-03
1.51E-03
1.50E-03
1.50E-03
1.52E-03
1.62E-03
1.56E-03
1.55E-03
1.52E-03
1.56E-03
30
1.52E-03
1.45E-03
1.46E-03
1.48E-03
1.48E-03
1.50E-03
1.60E-03
1.54E-03
1.53E-03
1.51E-03
1.56E-03
50
1.45E-03
1.39E-03
1.40E-03
1.41E-03
1.41E-03
1.46E-03
1.56E-03
1.50E-03
1.49E-03
1.46E-03
1.55E-03
60
1.46E-03
1.39E-03
1.40E-03
1.41E-03
1.41E-03
1.46E-03
1.56E-03
1.50E-03
1.49E-03
1.46E-03
1.55E-03
70
1.44E-03
1.36E-03
1.37E-03
1.39E-03
1.38E-03
1.46E-03
1.56E-03
1.50E-03
1.49E-03
1.47E-03
1.56E-03
1.51E-03
2.82E-05
1.64E-03
1.38E-03
1.51E-03
2.89E-05
1.64E-03
1.37E-03
1.51E-03
2.44E-05
1.62E-03
1.39E-03
1.48E-03
2.50E-05
1.59E-03
1.36E-03
1.41E-03
2.54E-05
1.53E-03
1.29E-03
1.41E-03
2.57E-05
1.53E-03
1.29E-03
1.39E-03
2.89E-05
1.52E-03
1.25E-03
1.52E-03
3.38E-05
1.68E-03
1.36E-03
2.20E-03
PASS
1.57E-03
3.73E-05
1.74E-03
1.39E-03
2.20E-03
PASS
1.55E-03
4.01E-05
1.74E-03
1.37E-03
2.20E-03
PASS
1.53E-03
3.90E-05
1.72E-03
1.35E-03
2.20E-03
PASS
1.49E-03
4.25E-05
1.69E-03
1.30E-03
2.20E-03
PASS
1.49E-03
4.18E-05
1.69E-03
1.30E-03
2.20E-03
PASS
1.49E-03
3.92E-05
1.68E-03
1.31E-03
2.20E-03
PASS
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ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Negative Supply Current @ +/-15V (A)
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
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ELDRS Report
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Table 5.2. Raw data for Negative Supply Current @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Supply Current @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-1.56E-03
-1.48E-03
-1.51E-03
-1.50E-03
-1.50E-03
-1.49E-03
-1.58E-03
-1.52E-03
-1.52E-03
-1.50E-03
-1.55E-03
10
-1.56E-03
-1.48E-03
-1.50E-03
-1.51E-03
-1.50E-03
-1.53E-03
-1.63E-03
-1.57E-03
-1.56E-03
-1.54E-03
-1.56E-03
20
-1.55E-03
-1.48E-03
-1.51E-03
-1.51E-03
-1.50E-03
-1.52E-03
-1.62E-03
-1.56E-03
-1.55E-03
-1.53E-03
-1.56E-03
30
-1.52E-03
-1.45E-03
-1.46E-03
-1.48E-03
-1.48E-03
-1.50E-03
-1.60E-03
-1.54E-03
-1.53E-03
-1.51E-03
-1.56E-03
50
-1.46E-03
-1.39E-03
-1.40E-03
-1.41E-03
-1.41E-03
-1.46E-03
-1.56E-03
-1.50E-03
-1.49E-03
-1.47E-03
-1.55E-03
60
-1.46E-03
-1.39E-03
-1.40E-03
-1.42E-03
-1.41E-03
-1.46E-03
-1.56E-03
-1.51E-03
-1.49E-03
-1.46E-03
-1.55E-03
70
-1.44E-03
-1.36E-03
-1.37E-03
-1.39E-03
-1.39E-03
-1.46E-03
-1.55E-03
-1.50E-03
-1.49E-03
-1.47E-03
-1.56E-03
-1.51E-03
2.83E-05
-1.38E-03
-1.64E-03
-1.51E-03
2.94E-05
-1.37E-03
-1.65E-03
-1.51E-03
2.49E-05
-1.39E-03
-1.62E-03
-1.48E-03
2.62E-05
-1.36E-03
-1.60E-03
-1.41E-03
2.58E-05
-1.29E-03
-1.53E-03
-1.42E-03
2.53E-05
-1.30E-03
-1.53E-03
-1.39E-03
2.96E-05
-1.25E-03
-1.53E-03
-1.52E-03
3.36E-05
-1.37E-03
-1.68E-03
-2.20E-03
PASS
-1.57E-03
3.74E-05
-1.39E-03
-1.74E-03
-2.20E-03
PASS
-1.55E-03
3.95E-05
-1.37E-03
-1.74E-03
-2.20E-03
PASS
-1.53E-03
3.95E-05
-1.35E-03
-1.72E-03
-2.20E-03
PASS
-1.49E-03
4.22E-05
-1.30E-03
-1.69E-03
-2.20E-03
PASS
-1.49E-03
4.10E-05
-1.30E-03
-1.69E-03
-2.20E-03
PASS
-1.49E-03
3.80E-05
-1.32E-03
-1.67E-03
-2.20E-03
PASS
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ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 1 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.3. Plot of Offset Voltage 1 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
12
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.3. Raw data for Offset Voltage 1 @ +/-15V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 1 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Total Dose (krad(Si))
0
8.40E-07
2.14E-05
8.05E-05
-4.70E-05
2.78E-05
-4.59E-06
7.61E-05
-2.06E-06
-3.38E-05
-3.73E-05
3.86E-06
Biased Statistics
Average Biased
1.67E-05
Std Dev Biased
4.62E-05
Ps99%/90% (+KTL) Biased
2.32E-04
Ps99%/90% (-KTL) Biased
-1.99E-04
Un-Biased Statistics
Average Un-Biased
-3.44E-07
Std Dev Un-Biased
4.57E-05
Ps99%/90% (+KTL) Un-Biased 2.13E-04
Ps99%/90% (-KTL) Un-Biased -2.14E-04
Specification MIN
-3.00E-04
Status
PASS
Specification MAX
3.00E-04
Status
PASS
24-hr
Anneal
168-hr
Anneal
10
-1.20E-05
2.37E-05
8.36E-05
-5.77E-05
2.32E-05
-3.70E-07
8.24E-05
7.00E-06
-2.40E-05
-2.85E-05
2.77E-06
20
-3.70E-07
3.23E-05
9.26E-05
-4.83E-05
3.52E-05
1.01E-05
8.90E-05
1.38E-05
-1.51E-05
-1.98E-05
-2.50E-07
30
6.64E-06
4.08E-05
1.13E-04
-3.42E-05
4.70E-05
2.14E-05
9.22E-05
1.65E-05
-6.16E-06
-1.26E-05
0.00E+00
50
2.86E-05
5.83E-05
1.24E-04
-1.22E-05
7.98E-05
3.20E-05
1.03E-04
3.11E-05
6.03E-06
1.20E-07
1.44E-06
60
2.40E-05
5.71E-05
1.26E-04
-9.90E-06
7.60E-05
3.25E-05
1.03E-04
2.97E-05
6.03E-06
2.05E-06
2.17E-06
70
1.56E-05
4.83E-05
1.27E-04
-3.21E-05
6.92E-05
2.11E-05
1.04E-04
1.91E-05
-1.28E-05
-1.68E-05
1.08E-06
1.21E-05
5.20E-05
2.55E-04
-2.31E-04
2.23E-05
5.17E-05
2.64E-04
-2.19E-04
3.47E-05
5.46E-05
2.89E-04
-2.20E-04
5.57E-05
5.15E-05
2.96E-04
-1.85E-04
5.46E-05
5.15E-05
2.95E-04
-1.86E-04
4.57E-05
5.96E-05
3.24E-04
-2.32E-04
7.29E-06
4.46E-05
2.15E-04
-2.01E-04
-4.50E-04
PASS
4.50E-04
PASS
1.56E-05
4.36E-05
2.19E-04
-1.88E-04
-4.50E-04
PASS
4.50E-04
PASS
2.23E-05
4.17E-05
2.17E-04
-1.72E-04
-4.50E-04
PASS
4.50E-04
PASS
3.45E-05
4.11E-05
2.26E-04
-1.57E-04
-6.00E-04
PASS
6.00E-04
PASS
3.46E-05
4.04E-05
2.23E-04
-1.54E-04
-6.00E-04
PASS
6.00E-04
PASS
2.29E-05
4.86E-05
2.49E-04
-2.04E-04
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2000 Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 2 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.4. Plot of Offset Voltage 2 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.4. Raw data for Offset Voltage 2 @ +/-15V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 2 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Total Dose (krad(Si))
0
-4.22E-05
5.59E-05
7.15E-05
-6.74E-05
5.54E-05
-8.58E-06
1.20E-06
2.99E-05
2.43E-05
-2.86E-05
4.78E-05
Biased Statistics
Average Biased
1.47E-05
Std Dev Biased
6.43E-05
Ps99%/90% (+KTL) Biased
3.15E-04
Ps99%/90% (-KTL) Biased
-2.85E-04
Un-Biased Statistics
Average Un-Biased
3.64E-06
Std Dev Un-Biased
2.40E-05
Ps99%/90% (+KTL) Un-Biased 1.16E-04
Ps99%/90% (-KTL) Un-Biased -1.09E-04
Specification MIN
-3.00E-04
Status
PASS
Specification MAX
3.00E-04
Status
FAIL
24-hr
Anneal
168-hr
Anneal
10
-3.85E-05
6.56E-05
7.81E-05
-6.08E-05
5.64E-05
-7.73E-06
6.64E-06
3.44E-05
3.67E-05
-1.46E-05
4.89E-05
20
-2.67E-05
8.27E-05
9.02E-05
-4.99E-05
6.96E-05
2.30E-07
1.81E-05
3.69E-05
4.60E-05
-2.66E-06
4.91E-05
30
-1.52E-05
9.16E-05
1.03E-04
-3.76E-05
8.11E-05
5.91E-06
2.76E-05
3.97E-05
4.97E-05
4.46E-06
4.95E-05
50
6.87E-06
1.10E-04
1.20E-04
-1.51E-05
1.00E-04
2.12E-05
4.67E-05
4.24E-05
6.61E-05
2.41E-05
4.73E-05
60
7.60E-06
1.09E-04
1.20E-04
-1.44E-05
1.02E-04
1.99E-05
4.68E-05
4.43E-05
6.72E-05
2.43E-05
4.84E-05
70
-2.30E-06
7.51E-05
1.07E-04
-3.39E-05
8.61E-05
-3.15E-06
4.98E-05
3.62E-05
4.07E-05
-4.11E-06
5.02E-05
2.02E-05
6.47E-05
3.22E-04
-2.82E-04
3.32E-05
6.61E-05
3.42E-04
-2.75E-04
4.46E-05
6.57E-05
3.51E-04
-2.62E-04
6.45E-05
6.35E-05
3.61E-04
-2.32E-04
6.50E-05
6.33E-05
3.60E-04
-2.30E-04
4.63E-05
6.09E-05
3.31E-04
-2.38E-04
1.11E-05
2.36E-05
1.21E-04
-9.92E-05
-4.50E-04
PASS
4.50E-04
PASS
1.97E-05
2.16E-05
1.21E-04
-8.11E-05
-4.50E-04
PASS
4.50E-04
PASS
2.55E-05
2.01E-05
1.19E-04
-6.84E-05
-4.50E-04
PASS
4.50E-04
PASS
4.01E-05
1.83E-05
1.25E-04
-4.52E-05
-6.00E-04
PASS
6.00E-04
PASS
4.05E-05
1.91E-05
1.30E-04
-4.85E-05
-6.00E-04
PASS
6.00E-04
PASS
2.39E-05
2.56E-05
1.43E-04
-9.56E-05
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2000 Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 3 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.5. Plot of Offset Voltage 3 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.5. Raw data for Offset Voltage 3 @ +/-15V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 3 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Total Dose (krad(Si))
0
-4.60E-05
-7.98E-05
1.14E-05
-8.33E-05
2.39E-05
-2.20E-05
-2.30E-05
3.44E-05
-2.19E-05
2.66E-05
-4.35E-05
Biased Statistics
Average Biased
-3.48E-05
Std Dev Biased
5.02E-05
Ps99%/90% (+KTL) Biased
2.00E-04
Ps99%/90% (-KTL) Biased
-2.69E-04
Un-Biased Statistics
Average Un-Biased
-1.16E-06
Std Dev Un-Biased
2.90E-05
Ps99%/90% (+KTL) Un-Biased 1.34E-04
Ps99%/90% (-KTL) Un-Biased -1.37E-04
Specification MIN
-3.00E-04
Status
PASS
Specification MAX
3.00E-04
Status
PASS
24-hr
Anneal
168-hr
Anneal
10
-4.40E-05
-7.50E-05
1.22E-05
-8.67E-05
2.89E-05
-2.14E-05
-1.81E-05
4.79E-05
-1.00E-05
4.11E-05
-4.26E-05
20
-3.14E-05
-6.33E-05
1.63E-05
-7.77E-05
4.03E-05
-1.75E-05
-1.28E-05
5.56E-05
2.30E-07
4.98E-05
-4.64E-05
30
-2.71E-05
-5.11E-05
1.99E-05
-6.59E-05
5.26E-05
-1.05E-05
-1.03E-05
5.43E-05
8.33E-06
5.64E-05
-4.40E-05
50
-7.85E-06
-3.32E-05
4.55E-05
-4.27E-05
6.96E-05
-3.14E-06
-3.75E-06
6.40E-05
2.06E-05
7.29E-05
-4.00E-05
60
-1.22E-05
-3.33E-05
4.53E-05
-4.18E-05
6.84E-05
-2.30E-06
-6.16E-06
6.54E-05
2.22E-05
7.41E-05
-4.47E-05
70
-2.23E-05
-4.44E-05
3.93E-05
-4.99E-05
7.68E-05
-1.09E-05
-6.89E-06
6.29E-05
1.88E-05
5.49E-05
-3.85E-05
-3.29E-05
5.16E-05
2.08E-04
-2.74E-04
-2.32E-05
5.06E-05
2.13E-04
-2.59E-04
-1.43E-05
4.96E-05
2.17E-04
-2.46E-04
6.27E-06
4.93E-05
2.36E-04
-2.24E-04
5.28E-06
4.90E-05
2.34E-04
-2.23E-04
-1.06E-07
5.57E-05
2.60E-04
-2.60E-04
7.89E-06
3.38E-05
1.65E-04
-1.50E-04
-4.50E-04
PASS
4.50E-04
PASS
1.51E-05
3.50E-05
1.79E-04
-1.48E-04
-4.50E-04
PASS
4.50E-04
PASS
1.97E-05
3.35E-05
1.76E-04
-1.37E-04
-4.50E-04
PASS
4.50E-04
PASS
3.01E-05
3.65E-05
2.00E-04
-1.40E-04
-6.00E-04
PASS
6.00E-04
PASS
3.07E-05
3.74E-05
2.05E-04
-1.44E-04
-6.00E-04
PASS
6.00E-04
PASS
2.38E-05
3.41E-05
1.83E-04
-1.36E-04
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2000 Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 4 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.6. Plot of Offset Voltage 4 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.6. Raw data for Offset Voltage 4 @ +/-15V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 4 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Total Dose (krad(Si))
0
-6.77E-06
6.93E-05
-4.58E-05
1.78E-05
7.55E-05
1.80E-05
5.19E-05
5.91E-05
2.25E-05
-5.79E-05
-9.06E-06
Biased Statistics
Average Biased
2.20E-05
Std Dev Biased
5.13E-05
Ps99%/90% (+KTL) Biased
2.61E-04
Ps99%/90% (-KTL) Biased
-2.17E-04
Un-Biased Statistics
Average Un-Biased
1.87E-05
Std Dev Un-Biased
4.64E-05
Ps99%/90% (+KTL) Un-Biased 2.35E-04
Ps99%/90% (-KTL) Un-Biased -1.98E-04
Specification MIN
-3.00E-04
Status
PASS
Specification MAX
3.00E-04
Status
PASS
24-hr
Anneal
168-hr
Anneal
10
-7.49E-06
8.01E-05
-3.74E-05
2.09E-05
6.28E-05
2.83E-05
5.87E-05
6.76E-05
6.55E-05
-1.66E-05
-1.16E-05
20
2.89E-06
9.87E-05
-2.56E-05
3.38E-05
8.00E-05
3.45E-05
6.17E-05
7.14E-05
7.77E-05
-2.91E-06
-7.85E-06
30
1.07E-05
1.06E-04
-1.98E-05
4.30E-05
9.09E-05
4.10E-05
6.74E-05
8.08E-05
8.43E-05
4.83E-06
-8.94E-06
50
1.77E-05
1.31E-04
5.19E-06
6.29E-05
1.14E-04
6.31E-05
7.66E-05
9.76E-05
1.04E-04
2.23E-05
-1.22E-05
60
2.32E-05
1.29E-04
2.65E-06
6.20E-05
1.15E-04
6.11E-05
7.81E-05
9.48E-05
1.04E-04
2.18E-05
-9.06E-06
70
5.79E-06
1.26E-04
-1.29E-05
6.35E-05
9.02E-05
3.02E-05
6.69E-05
7.14E-05
8.48E-05
9.04E-06
-1.18E-05
2.38E-05
4.85E-05
2.50E-04
-2.03E-04
3.80E-05
5.18E-05
2.80E-04
-2.04E-04
4.62E-05
5.29E-05
2.93E-04
-2.01E-04
6.60E-05
5.59E-05
3.27E-04
-1.95E-04
6.63E-05
5.52E-05
3.24E-04
-1.91E-04
5.45E-05
5.78E-05
3.24E-04
-2.15E-04
4.07E-05
3.57E-05
2.07E-04
-1.26E-04
-4.50E-04
PASS
4.50E-04
PASS
4.85E-05
3.31E-05
2.03E-04
-1.06E-04
-4.50E-04
PASS
4.50E-04
PASS
5.57E-05
3.31E-05
2.10E-04
-9.88E-05
-4.50E-04
PASS
4.50E-04
PASS
7.27E-05
3.25E-05
2.24E-04
-7.90E-05
-6.00E-04
PASS
6.00E-04
PASS
7.19E-05
3.24E-05
2.23E-04
-7.92E-05
-6.00E-04
PASS
6.00E-04
PASS
5.25E-05
3.16E-05
2.00E-04
-9.50E-05
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2000 Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 1 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.7. Plot of Offset Current 1 @ +/-15V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.7. Raw data for Offset Current 1 @ +/-15V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 1 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.13E-10
5.00E-12
-9.40E-11
-1.34E-10
8.00E-12
-7.50E-11
-1.18E-10
1.43E-10
-1.06E-10
-6.00E-12
-1.80E-11
10
1.75E-10
2.50E-11
-6.10E-11
-1.22E-10
-3.80E-11
-4.10E-11
-7.20E-11
1.33E-10
-4.00E-11
5.40E-11
-1.80E-11
20
1.52E-10
-4.90E-11
1.36E-10
-1.51E-10
3.00E-11
2.40E-11
1.40E-11
8.50E-11
-6.00E-11
5.00E-11
-1.30E-11
30
1.00E-10
-4.10E-11
9.11E-10
-1.18E-10
-9.00E-12
-8.00E-12
2.90E-11
2.02E-10
-4.20E-11
5.60E-11
-2.00E-12
50
1.42E-10
-5.30E-11
9.82E-10
-3.60E-11
8.80E-11
7.60E-11
1.61E-10
3.16E-10
1.08E-10
1.79E-10
-1.90E-11
60
2.10E-10
-5.80E-11
9.79E-10
-7.00E-12
5.40E-11
7.50E-11
1.74E-10
2.98E-10
9.30E-11
2.05E-10
-3.20E-11
70
-4.10E-11
7.30E-11
6.97E-10
-3.30E-11
-1.40E-11
1.66E-10
-3.90E-11
1.76E-10
4.50E-11
1.45E-10
-3.50E-11
-2.04E-11
9.69E-11
4.32E-10
-4.73E-10
-4.20E-12
1.13E-10
5.24E-10
-5.32E-10
2.36E-11
1.27E-10
6.18E-10
-5.71E-10
1.69E-10
4.22E-10
2.14E-09
-1.80E-09
2.25E-10
4.31E-10
2.24E-09
-1.79E-09
2.36E-10
4.28E-10
2.23E-09
-1.76E-09
1.36E-10
3.17E-10
1.61E-09
-1.34E-09
-3.24E-11
1.07E-10
4.68E-10
-5.33E-10
-1.00E-08
PASS
1.00E-08
PASS
6.80E-12
8.49E-11
4.03E-10
-3.89E-10
-1.00E-08
PASS
1.00E-08
PASS
2.26E-11
5.37E-11
2.73E-10
-2.28E-10
-1.00E-08
PASS
1.00E-08
PASS
4.74E-11
9.40E-11
4.86E-10
-3.91E-10
-1.00E-08
PASS
1.00E-08
PASS
1.68E-10
9.24E-11
5.99E-10
-2.63E-10
-1.50E-08
PASS
1.50E-08
PASS
1.69E-10
9.02E-11
5.90E-10
-2.52E-10
-1.50E-08
PASS
1.50E-08
PASS
9.86E-11
9.29E-11
5.32E-10
-3.35E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 2 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.8. Plot of Offset Current 2 @ +/-15V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.8. Raw data for Offset Current 2 @ +/-15V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 2 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-2.10E-11
-7.80E-11
2.80E-11
3.90E-11
9.60E-11
8.10E-11
-1.51E-10
1.12E-10
-4.00E-11
-2.50E-11
5.90E-11
10
-7.10E-11
-9.90E-11
8.00E-11
1.00E-10
8.50E-11
1.53E-10
-2.50E-10
1.32E-10
1.50E-11
5.00E-12
2.90E-11
20
5.00E-11
-9.10E-11
2.30E-11
1.80E-10
1.93E-10
1.67E-10
-2.07E-10
1.80E-10
9.60E-11
5.30E-11
4.50E-11
30
3.00E-11
-4.50E-11
6.50E-11
1.68E-10
2.94E-10
1.94E-10
-2.11E-10
1.37E-10
8.40E-11
-2.90E-11
3.50E-11
50
-6.00E-12
6.90E-11
4.90E-11
3.26E-10
3.38E-10
2.23E-10
-2.24E-10
3.85E-10
1.46E-10
8.90E-11
7.00E-12
60
4.40E-11
5.50E-11
4.60E-11
2.82E-10
3.32E-10
2.24E-10
-2.19E-10
3.70E-10
1.07E-10
5.80E-11
2.30E-11
70
-3.30E-11
-1.47E-10
-5.60E-11
2.33E-10
2.05E-10
1.46E-10
-3.36E-10
2.70E-10
1.47E-10
8.00E-12
2.90E-11
1.28E-11
6.56E-11
3.19E-10
-2.93E-10
1.90E-11
9.57E-11
4.66E-10
-4.28E-10
7.10E-11
1.18E-10
6.22E-10
-4.80E-10
1.02E-10
1.32E-10
7.17E-10
-5.12E-10
1.55E-10
1.64E-10
9.19E-10
-6.09E-10
1.52E-10
1.43E-10
8.18E-10
-5.15E-10
4.04E-11
1.69E-10
8.28E-10
-7.47E-10
-4.60E-12
1.05E-10
4.85E-10
-4.94E-10
-1.00E-08
PASS
1.00E-08
PASS
1.10E-11
1.60E-10
7.60E-10
-7.38E-10
-1.00E-08
PASS
1.00E-08
PASS
5.78E-11
1.57E-10
7.90E-10
-6.74E-10
-1.00E-08
PASS
1.00E-08
PASS
3.50E-11
1.60E-10
7.83E-10
-7.13E-10
-1.00E-08
PASS
1.00E-08
PASS
1.24E-10
2.24E-10
1.17E-09
-9.21E-10
-1.50E-08
PASS
1.50E-08
PASS
1.08E-10
2.19E-10
1.13E-09
-9.13E-10
-1.50E-08
PASS
1.50E-08
PASS
4.70E-11
2.33E-10
1.14E-09
-1.04E-09
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 3 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.9. Plot of Offset Current 3 @ +/-15V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.9. Raw data for Offset Current 3 @ +/-15V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 3 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-1.50E-11
3.00E-11
-3.00E-11
-4.40E-11
-5.30E-11
3.60E-11
-4.00E-11
1.00E-12
-4.90E-11
-9.10E-11
3.00E-11
10
-2.70E-11
3.50E-11
-3.50E-11
-3.00E-12
-1.40E-11
6.40E-11
-2.10E-11
8.00E-12
6.00E-12
-5.70E-11
4.30E-11
20
7.00E-12
9.00E-12
-5.30E-11
5.00E-11
4.70E-11
1.07E-10
4.60E-11
6.30E-11
8.50E-11
-8.10E-11
-3.10E-11
30
-5.20E-11
7.40E-11
2.37E-09
1.35E-10
6.70E-11
8.90E-11
5.10E-11
6.30E-11
1.10E-10
4.20E-11
-1.00E-11
50
2.60E-11
1.22E-10
1.44E-09
1.12E-10
1.73E-10
1.28E-10
8.20E-11
1.06E-10
1.47E-10
1.28E-10
-1.00E-12
60
-3.00E-11
1.32E-10
1.41E-09
9.30E-11
2.22E-10
1.31E-10
-3.40E-11
1.36E-10
1.44E-10
9.90E-11
2.20E-11
70
-3.10E-11
-5.00E-12
6.12E-10
1.03E-10
3.10E-11
1.76E-10
9.40E-11
5.70E-11
1.78E-10
8.00E-11
3.00E-11
-2.24E-11
3.26E-11
1.30E-10
-1.75E-10
-8.80E-12
2.74E-11
1.19E-10
-1.37E-10
1.20E-11
4.16E-11
2.06E-10
-1.82E-10
5.19E-10
1.04E-09
5.36E-09
-4.33E-09
3.75E-10
5.98E-10
3.16E-09
-2.42E-09
3.65E-10
5.90E-10
3.12E-09
-2.39E-09
1.42E-10
2.68E-10
1.39E-09
-1.11E-09
-2.86E-11
4.87E-11
1.99E-10
-2.56E-10
-1.00E-08
PASS
1.00E-08
PASS
0.00E+00
4.44E-11
2.07E-10
-2.07E-10
-1.00E-08
PASS
1.00E-08
PASS
4.40E-11
7.36E-11
3.87E-10
-2.99E-10
-1.00E-08
PASS
1.00E-08
PASS
7.10E-11
2.81E-11
2.02E-10
-5.99E-11
-1.00E-08
PASS
1.00E-08
PASS
1.18E-10
2.49E-11
2.34E-10
2.00E-12
-1.50E-08
PASS
1.50E-08
PASS
9.52E-11
7.42E-11
4.42E-10
-2.51E-10
-1.50E-08
PASS
1.50E-08
PASS
1.17E-10
5.63E-11
3.80E-10
-1.46E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 4 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of Offset Current 4 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.10. Raw data for Offset Current 4 @ +/-15V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 4 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.25E-10
-4.90E-11
-4.00E-12
-5.90E-11
-1.23E-10
-1.10E-11
1.20E-11
9.80E-11
-2.51E-10
-6.50E-11
-5.50E-11
10
1.41E-10
-4.10E-11
3.40E-11
6.60E-11
-4.20E-11
6.30E-11
1.06E-10
2.30E-11
-1.73E-10
-2.30E-11
-5.80E-11
20
1.94E-10
-1.50E-11
9.30E-11
1.70E-10
-1.50E-11
0.00E+00
6.90E-11
1.18E-10
-1.50E-10
-3.50E-11
-9.50E-11
30
1.84E-10
1.94E-10
2.99E-09
2.22E-10
-6.60E-11
-5.60E-11
1.12E-10
1.73E-10
-1.85E-10
-5.90E-11
-7.80E-11
50
2.43E-10
1.76E-10
1.87E-09
2.42E-10
-7.00E-11
-1.50E-11
6.60E-11
1.87E-10
-6.10E-11
1.00E-11
-2.60E-11
60
1.86E-10
1.62E-10
1.88E-09
2.35E-10
-9.10E-11
-1.53E-10
-5.00E-11
-5.00E-12
-2.48E-10
-7.70E-11
-4.20E-11
70
1.10E-10
2.26E-10
8.67E-10
2.18E-10
-2.08E-10
1.05E-10
1.56E-10
2.06E-10
-1.08E-10
-6.00E-12
-8.80E-11
-2.20E-11
9.25E-11
4.10E-10
-4.54E-10
3.16E-11
7.72E-11
3.92E-10
-3.29E-10
8.54E-11
9.90E-11
5.47E-10
-3.76E-10
7.04E-10
1.28E-09
6.69E-09
-5.28E-09
4.91E-10
7.79E-10
4.12E-09
-3.14E-09
4.75E-10
7.97E-10
4.19E-09
-3.24E-09
2.43E-10
3.91E-10
2.07E-09
-1.58E-09
-4.34E-11
1.30E-10
5.64E-10
-6.50E-10
-1.00E-08
PASS
1.00E-08
PASS
-8.00E-13
1.07E-10
5.01E-10
-5.02E-10
-1.00E-08
PASS
1.00E-08
PASS
4.00E-13
1.03E-10
4.81E-10
-4.80E-10
-1.00E-08
PASS
1.00E-08
PASS
-3.00E-12
1.44E-10
6.70E-10
-6.76E-10
-1.00E-08
PASS
1.00E-08
PASS
3.74E-11
9.54E-11
4.82E-10
-4.08E-10
-1.50E-08
PASS
1.50E-08
PASS
-1.07E-10
9.56E-11
3.39E-10
-5.53E-10
-1.50E-08
PASS
1.50E-08
PASS
7.06E-11
1.27E-10
6.63E-10
-5.22E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 1 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.11. Plot of Positive Bias Current 1 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.11. Raw data for Positive Bias Current 1 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 1 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.21E-08
1.09E-08
1.17E-08
1.17E-08
1.19E-08
1.17E-08
1.11E-08
1.11E-08
1.24E-08
1.16E-08
1.06E-08
10
1.46E-08
1.30E-08
1.38E-08
1.41E-08
1.43E-08
1.35E-08
1.29E-08
1.29E-08
1.42E-08
1.34E-08
1.06E-08
20
1.81E-08
1.62E-08
1.70E-08
1.73E-08
1.75E-08
1.56E-08
1.49E-08
1.50E-08
1.64E-08
1.55E-08
1.06E-08
30
2.12E-08
1.90E-08
1.81E-08
2.03E-08
2.05E-08
1.74E-08
1.66E-08
1.66E-08
1.82E-08
1.73E-08
1.06E-08
50
2.80E-08
2.52E-08
2.46E-08
2.66E-08
2.69E-08
2.11E-08
2.02E-08
2.02E-08
2.20E-08
2.09E-08
1.06E-08
60
2.80E-08
2.53E-08
2.47E-08
2.67E-08
2.70E-08
2.10E-08
2.02E-08
2.02E-08
2.20E-08
2.09E-08
1.06E-08
70
2.55E-08
2.33E-08
2.41E-08
2.47E-08
2.53E-08
1.95E-08
1.86E-08
1.88E-08
2.04E-08
1.94E-08
1.06E-08
1.17E-08
4.66E-10
1.38E-08
9.49E-09
1.39E-08
6.02E-10
1.68E-08
1.11E-08
1.72E-08
6.97E-10
2.05E-08
1.40E-08
1.98E-08
1.26E-09
2.57E-08
1.40E-08
2.62E-08
1.36E-09
3.26E-08
1.99E-08
2.63E-08
1.34E-09
3.26E-08
2.01E-08
2.46E-08
9.11E-10
2.88E-08
2.03E-08
1.16E-08
5.40E-10
1.41E-08
9.06E-09
-3.00E-08
PASS
3.00E-08
PASS
1.34E-08
5.67E-10
1.60E-08
1.07E-08
-6.00E-08
PASS
6.00E-08
PASS
1.55E-08
5.94E-10
1.82E-08
1.27E-08
-7.50E-08
PASS
7.50E-08
PASS
1.72E-08
6.57E-10
2.03E-08
1.42E-08
-7.50E-08
PASS
7.50E-08
PASS
2.09E-08
7.32E-10
2.43E-08
1.75E-08
-1.00E-07
PASS
1.00E-07
PASS
2.09E-08
7.24E-10
2.42E-08
1.75E-08
-1.00E-07
PASS
1.00E-07
PASS
1.93E-08
6.93E-10
2.26E-08
1.61E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
29
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 2 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.12. Plot of Positive Bias Current 2 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.12. Raw data for Positive Bias Current 2 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 2 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.14E-08
1.24E-08
1.18E-08
1.20E-08
1.24E-08
1.24E-08
1.20E-08
1.12E-08
1.23E-08
1.26E-08
1.06E-08
10
1.37E-08
1.47E-08
1.41E-08
1.43E-08
1.48E-08
1.42E-08
1.40E-08
1.29E-08
1.41E-08
1.46E-08
1.07E-08
20
1.70E-08
1.81E-08
1.74E-08
1.76E-08
1.84E-08
1.62E-08
1.61E-08
1.48E-08
1.62E-08
1.68E-08
1.07E-08
30
1.99E-08
2.11E-08
1.97E-08
2.08E-08
2.14E-08
1.80E-08
1.79E-08
1.67E-08
1.80E-08
1.88E-08
1.06E-08
50
2.64E-08
2.76E-08
2.62E-08
2.73E-08
2.81E-08
2.19E-08
2.18E-08
2.01E-08
2.20E-08
2.29E-08
1.06E-08
60
2.64E-08
2.77E-08
2.63E-08
2.74E-08
2.82E-08
2.18E-08
2.18E-08
2.02E-08
2.20E-08
2.28E-08
1.06E-08
70
2.40E-08
2.61E-08
2.50E-08
2.52E-08
2.62E-08
2.02E-08
2.01E-08
1.84E-08
2.02E-08
2.11E-08
1.06E-08
1.20E-08
4.22E-10
1.40E-08
1.00E-08
1.44E-08
4.43E-10
1.64E-08
1.23E-08
1.77E-08
5.56E-10
2.03E-08
1.51E-08
2.06E-08
7.63E-10
2.41E-08
1.70E-08
2.71E-08
8.06E-10
3.09E-08
2.34E-08
2.72E-08
8.26E-10
3.11E-08
2.33E-08
2.53E-08
9.15E-10
2.96E-08
2.10E-08
1.21E-08
5.64E-10
1.47E-08
9.46E-09
-3.00E-08
PASS
3.00E-08
PASS
1.40E-08
6.46E-10
1.70E-08
1.09E-08
-6.00E-08
PASS
6.00E-08
PASS
1.60E-08
7.34E-10
1.94E-08
1.26E-08
-7.50E-08
PASS
7.50E-08
PASS
1.79E-08
7.84E-10
2.15E-08
1.42E-08
-7.50E-08
PASS
7.50E-08
PASS
2.17E-08
9.95E-10
2.64E-08
1.71E-08
-1.00E-07
PASS
1.00E-07
PASS
2.17E-08
9.72E-10
2.63E-08
1.72E-08
-1.00E-07
PASS
1.00E-07
PASS
2.00E-08
9.90E-10
2.46E-08
1.54E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
31
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 3 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.13. Plot of Positive Bias Current 3 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.13. Raw data for Positive Bias Current 3 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 3 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.10E-08
1.18E-08
1.13E-08
1.22E-08
1.21E-08
1.20E-08
1.12E-08
1.07E-08
1.20E-08
1.16E-08
1.02E-08
10
1.32E-08
1.40E-08
1.36E-08
1.47E-08
1.45E-08
1.38E-08
1.30E-08
1.24E-08
1.38E-08
1.34E-08
1.03E-08
20
1.64E-08
1.73E-08
1.66E-08
1.80E-08
1.80E-08
1.57E-08
1.50E-08
1.43E-08
1.58E-08
1.55E-08
1.03E-08
30
1.94E-08
2.03E-08
1.81E-08
2.10E-08
2.10E-08
1.75E-08
1.68E-08
1.61E-08
1.76E-08
1.74E-08
1.02E-08
50
2.54E-08
2.65E-08
2.46E-08
2.77E-08
2.77E-08
2.12E-08
2.04E-08
1.96E-08
2.14E-08
2.11E-08
1.02E-08
60
2.56E-08
2.66E-08
2.48E-08
2.78E-08
2.77E-08
2.11E-08
2.04E-08
1.95E-08
2.13E-08
2.10E-08
1.02E-08
70
2.32E-08
2.49E-08
2.37E-08
2.55E-08
2.57E-08
1.94E-08
1.88E-08
1.79E-08
1.96E-08
1.95E-08
1.02E-08
1.17E-08
5.27E-10
1.41E-08
9.21E-09
1.40E-08
5.91E-10
1.68E-08
1.12E-08
1.73E-08
7.30E-10
2.07E-08
1.38E-08
2.00E-08
1.24E-09
2.57E-08
1.42E-08
2.64E-08
1.35E-09
3.27E-08
2.01E-08
2.65E-08
1.32E-09
3.26E-08
2.03E-08
2.46E-08
1.13E-09
2.98E-08
1.93E-08
1.15E-08
5.30E-10
1.40E-08
9.02E-09
-3.00E-08
PASS
3.00E-08
PASS
1.33E-08
5.92E-10
1.60E-08
1.05E-08
-6.00E-08
PASS
6.00E-08
PASS
1.53E-08
6.20E-10
1.82E-08
1.24E-08
-7.50E-08
PASS
7.50E-08
PASS
1.71E-08
6.32E-10
2.00E-08
1.41E-08
-7.50E-08
PASS
7.50E-08
PASS
2.07E-08
7.21E-10
2.41E-08
1.74E-08
-1.00E-07
PASS
1.00E-07
PASS
2.07E-08
7.21E-10
2.40E-08
1.73E-08
-1.00E-07
PASS
1.00E-07
PASS
1.90E-08
6.87E-10
2.23E-08
1.58E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 4 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.14. Plot of Positive Bias Current 4 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.14. Raw data for Positive Bias Current 4 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 4 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.23E-08
1.18E-08
1.20E-08
1.20E-08
1.30E-08
1.20E-08
1.15E-08
1.20E-08
1.30E-08
1.19E-08
1.10E-08
10
1.51E-08
1.41E-08
1.42E-08
1.45E-08
1.53E-08
1.39E-08
1.33E-08
1.40E-08
1.48E-08
1.38E-08
1.10E-08
20
1.86E-08
1.74E-08
1.75E-08
1.77E-08
1.89E-08
1.60E-08
1.54E-08
1.60E-08
1.70E-08
1.59E-08
1.10E-08
30
2.19E-08
2.04E-08
1.94E-08
2.08E-08
2.21E-08
1.80E-08
1.72E-08
1.79E-08
1.89E-08
1.78E-08
1.10E-08
50
2.87E-08
2.67E-08
2.62E-08
2.73E-08
2.90E-08
2.19E-08
2.11E-08
2.18E-08
2.29E-08
2.16E-08
1.10E-08
60
2.90E-08
2.68E-08
2.63E-08
2.74E-08
2.91E-08
2.18E-08
2.11E-08
2.18E-08
2.29E-08
2.16E-08
1.10E-08
70
2.61E-08
2.49E-08
2.53E-08
2.52E-08
2.72E-08
2.01E-08
1.93E-08
2.01E-08
2.11E-08
2.01E-08
1.10E-08
1.22E-08
4.76E-10
1.45E-08
1.00E-08
1.46E-08
5.34E-10
1.71E-08
1.21E-08
1.80E-08
6.79E-10
2.12E-08
1.48E-08
2.09E-08
1.10E-09
2.60E-08
1.58E-08
2.76E-08
1.23E-09
3.33E-08
2.19E-08
2.77E-08
1.25E-09
3.35E-08
2.19E-08
2.57E-08
9.39E-10
3.01E-08
2.14E-08
1.21E-08
5.41E-10
1.46E-08
9.57E-09
-3.00E-08
PASS
3.00E-08
PASS
1.40E-08
5.60E-10
1.66E-08
1.13E-08
-6.00E-08
PASS
6.00E-08
PASS
1.61E-08
5.50E-10
1.86E-08
1.35E-08
-7.50E-08
PASS
7.50E-08
PASS
1.80E-08
6.08E-10
2.08E-08
1.51E-08
-7.50E-08
PASS
7.50E-08
PASS
2.19E-08
6.58E-10
2.49E-08
1.88E-08
-1.00E-07
PASS
1.00E-07
PASS
2.19E-08
6.45E-10
2.49E-08
1.89E-08
-1.00E-07
PASS
1.00E-07
PASS
2.01E-08
6.52E-10
2.32E-08
1.71E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
35
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 1 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.15. Plot of Negative Bias Current 1 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.15. Raw data for Negative Bias Current 1 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 1 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.23E-08
1.09E-08
1.17E-08
1.16E-08
1.19E-08
1.17E-08
1.10E-08
1.12E-08
1.23E-08
1.16E-08
1.06E-08
10
1.49E-08
1.31E-08
1.39E-08
1.39E-08
1.43E-08
1.36E-08
1.29E-08
1.31E-08
1.42E-08
1.35E-08
1.06E-08
20
1.83E-08
1.63E-08
1.72E-08
1.72E-08
1.77E-08
1.58E-08
1.50E-08
1.52E-08
1.65E-08
1.56E-08
1.06E-08
30
2.14E-08
1.91E-08
1.91E-08
2.03E-08
2.07E-08
1.75E-08
1.67E-08
1.69E-08
1.82E-08
1.75E-08
1.06E-08
50
2.83E-08
2.53E-08
2.57E-08
2.67E-08
2.71E-08
2.14E-08
2.06E-08
2.07E-08
2.22E-08
2.12E-08
1.07E-08
60
2.83E-08
2.54E-08
2.58E-08
2.68E-08
2.72E-08
2.13E-08
2.05E-08
2.06E-08
2.21E-08
2.12E-08
1.06E-08
70
2.56E-08
2.35E-08
2.48E-08
2.47E-08
2.54E-08
1.97E-08
1.87E-08
1.89E-08
2.05E-08
1.97E-08
1.06E-08
1.17E-08
5.12E-10
1.41E-08
9.29E-09
1.40E-08
6.54E-10
1.71E-08
1.09E-08
1.73E-08
7.42E-10
2.08E-08
1.39E-08
2.01E-08
1.00E-09
2.48E-08
1.54E-08
2.66E-08
1.19E-09
3.21E-08
2.11E-08
2.67E-08
1.15E-09
3.21E-08
2.13E-08
2.48E-08
8.18E-10
2.86E-08
2.10E-08
1.16E-08
4.79E-10
1.38E-08
9.33E-09
-3.00E-08
PASS
3.00E-08
PASS
1.35E-08
5.03E-10
1.58E-08
1.11E-08
-6.00E-08
PASS
6.00E-08
PASS
1.56E-08
5.77E-10
1.83E-08
1.29E-08
-7.50E-08
PASS
7.50E-08
PASS
1.74E-08
5.79E-10
2.01E-08
1.47E-08
-7.50E-08
PASS
7.50E-08
PASS
2.12E-08
6.45E-10
2.42E-08
1.82E-08
-1.00E-07
PASS
1.00E-07
PASS
2.12E-08
6.43E-10
2.42E-08
1.81E-08
-1.00E-07
PASS
1.00E-07
PASS
1.95E-08
7.20E-10
2.29E-08
1.61E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 2 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.16. Plot of Negative Bias Current 2 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.16. Raw data for Negative Bias Current 2 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 2 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.14E-08
1.23E-08
1.19E-08
1.21E-08
1.25E-08
1.25E-08
1.19E-08
1.13E-08
1.23E-08
1.26E-08
1.07E-08
10
1.38E-08
1.46E-08
1.42E-08
1.45E-08
1.50E-08
1.44E-08
1.39E-08
1.30E-08
1.42E-08
1.46E-08
1.07E-08
20
1.71E-08
1.81E-08
1.75E-08
1.79E-08
1.86E-08
1.65E-08
1.59E-08
1.51E-08
1.64E-08
1.70E-08
1.08E-08
30
2.01E-08
2.12E-08
1.98E-08
2.10E-08
2.18E-08
1.84E-08
1.78E-08
1.69E-08
1.82E-08
1.90E-08
1.07E-08
50
2.65E-08
2.78E-08
2.64E-08
2.77E-08
2.86E-08
2.23E-08
2.17E-08
2.07E-08
2.22E-08
2.31E-08
1.07E-08
60
2.65E-08
2.79E-08
2.65E-08
2.78E-08
2.87E-08
2.21E-08
2.16E-08
2.06E-08
2.22E-08
2.31E-08
1.07E-08
70
2.41E-08
2.61E-08
2.50E-08
2.55E-08
2.66E-08
2.05E-08
1.99E-08
1.88E-08
2.05E-08
2.13E-08
1.07E-08
1.20E-08
4.31E-10
1.41E-08
1.00E-08
1.44E-08
4.62E-10
1.66E-08
1.23E-08
1.78E-08
5.78E-10
2.05E-08
1.51E-08
2.08E-08
8.26E-10
2.46E-08
1.69E-08
2.74E-08
9.29E-10
3.17E-08
2.31E-08
2.75E-08
9.45E-10
3.19E-08
2.31E-08
2.55E-08
9.74E-10
3.00E-08
2.09E-08
1.21E-08
5.59E-10
1.47E-08
9.51E-09
-3.00E-08
PASS
3.00E-08
PASS
1.40E-08
6.37E-10
1.70E-08
1.11E-08
-6.00E-08
PASS
6.00E-08
PASS
1.62E-08
7.16E-10
1.95E-08
1.28E-08
-7.50E-08
PASS
7.50E-08
PASS
1.81E-08
7.82E-10
2.17E-08
1.44E-08
-7.50E-08
PASS
7.50E-08
PASS
2.20E-08
8.83E-10
2.61E-08
1.79E-08
-1.00E-07
PASS
1.00E-07
PASS
2.19E-08
9.03E-10
2.61E-08
1.77E-08
-1.00E-07
PASS
1.00E-07
PASS
2.02E-08
9.07E-10
2.44E-08
1.60E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
39
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 3 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.17. Plot of Negative Bias Current 3 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.17. Raw data for Negative Bias Current 3 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 3 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.09E-08
1.19E-08
1.13E-08
1.23E-08
1.21E-08
1.21E-08
1.12E-08
1.07E-08
1.20E-08
1.16E-08
1.02E-08
10
1.32E-08
1.41E-08
1.36E-08
1.47E-08
1.45E-08
1.38E-08
1.31E-08
1.25E-08
1.39E-08
1.35E-08
1.03E-08
20
1.65E-08
1.73E-08
1.65E-08
1.81E-08
1.80E-08
1.59E-08
1.52E-08
1.44E-08
1.60E-08
1.56E-08
1.04E-08
30
1.94E-08
2.04E-08
2.06E-08
2.13E-08
2.12E-08
1.76E-08
1.70E-08
1.62E-08
1.79E-08
1.75E-08
1.03E-08
50
2.55E-08
2.68E-08
2.62E-08
2.79E-08
2.80E-08
2.15E-08
2.06E-08
1.99E-08
2.17E-08
2.14E-08
1.02E-08
60
2.57E-08
2.69E-08
2.64E-08
2.80E-08
2.81E-08
2.13E-08
2.06E-08
1.97E-08
2.16E-08
2.12E-08
1.03E-08
70
2.33E-08
2.50E-08
2.44E-08
2.57E-08
2.58E-08
1.97E-08
1.91E-08
1.82E-08
1.99E-08
1.97E-08
1.03E-08
1.17E-08
5.58E-10
1.43E-08
9.08E-09
1.40E-08
6.25E-10
1.69E-08
1.11E-08
1.73E-08
7.84E-10
2.10E-08
1.36E-08
2.06E-08
7.49E-10
2.41E-08
1.71E-08
2.69E-08
1.09E-09
3.20E-08
2.18E-08
2.70E-08
1.05E-09
3.19E-08
2.21E-08
2.49E-08
1.05E-09
2.98E-08
2.00E-08
1.15E-08
5.85E-10
1.42E-08
8.78E-09
-3.00E-08
PASS
3.00E-08
PASS
1.33E-08
5.96E-10
1.61E-08
1.06E-08
-6.00E-08
PASS
6.00E-08
PASS
1.54E-08
6.24E-10
1.83E-08
1.25E-08
-7.50E-08
PASS
7.50E-08
PASS
1.72E-08
6.41E-10
2.02E-08
1.43E-08
-7.50E-08
PASS
7.50E-08
PASS
2.10E-08
7.45E-10
2.45E-08
1.76E-08
-1.00E-07
PASS
1.00E-07
PASS
2.09E-08
7.75E-10
2.45E-08
1.73E-08
-1.00E-07
PASS
1.00E-07
PASS
1.93E-08
7.08E-10
2.26E-08
1.60E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
41
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 4 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.18. Plot of Negative Bias Current 4 @ +/-15V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.18. Raw data for Negative Bias Current 4 @ +/-15V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 4 @ +/-15V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.25E-08
1.18E-08
1.21E-08
1.21E-08
1.29E-08
1.21E-08
1.15E-08
1.22E-08
1.28E-08
1.20E-08
1.10E-08
10
1.52E-08
1.41E-08
1.43E-08
1.46E-08
1.54E-08
1.40E-08
1.34E-08
1.41E-08
1.47E-08
1.38E-08
1.11E-08
20
1.89E-08
1.75E-08
1.76E-08
1.79E-08
1.90E-08
1.62E-08
1.56E-08
1.63E-08
1.70E-08
1.60E-08
1.10E-08
30
2.21E-08
2.06E-08
2.25E-08
2.11E-08
2.21E-08
1.80E-08
1.74E-08
1.82E-08
1.89E-08
1.78E-08
1.11E-08
50
2.91E-08
2.71E-08
2.83E-08
2.76E-08
2.90E-08
2.20E-08
2.14E-08
2.21E-08
2.29E-08
2.18E-08
1.10E-08
60
2.92E-08
2.71E-08
2.84E-08
2.77E-08
2.91E-08
2.18E-08
2.12E-08
2.21E-08
2.28E-08
2.16E-08
1.10E-08
70
2.63E-08
2.53E-08
2.63E-08
2.56E-08
2.72E-08
2.03E-08
1.95E-08
2.05E-08
2.12E-08
2.01E-08
1.11E-08
1.23E-08
4.42E-10
1.43E-08
1.02E-08
1.47E-08
5.64E-10
1.73E-08
1.21E-08
1.82E-08
7.14E-10
2.15E-08
1.48E-08
2.17E-08
7.94E-10
2.54E-08
1.80E-08
2.82E-08
8.77E-10
3.23E-08
2.41E-08
2.83E-08
9.02E-10
3.25E-08
2.41E-08
2.61E-08
7.38E-10
2.96E-08
2.27E-08
1.21E-08
4.66E-10
1.43E-08
9.93E-09
-3.00E-08
PASS
3.00E-08
PASS
1.40E-08
4.72E-10
1.62E-08
1.18E-08
-6.00E-08
PASS
6.00E-08
PASS
1.62E-08
4.91E-10
1.85E-08
1.39E-08
-7.50E-08
PASS
7.50E-08
PASS
1.80E-08
5.47E-10
2.06E-08
1.55E-08
-7.50E-08
PASS
7.50E-08
PASS
2.20E-08
5.78E-10
2.47E-08
1.93E-08
-1.00E-07
PASS
1.00E-07
PASS
2.19E-08
5.78E-10
2.46E-08
1.92E-08
-1.00E-07
PASS
1.00E-07
PASS
2.03E-08
6.07E-10
2.32E-08
1.75E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
43
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
-2.00E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.19. Plot of Common Mode Rejection Ratio 1 (dB) versus total dose. The data show a significant
degradation with radiation, however it is not sufficient for the measured parameter to fall below specification.
Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which
relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of
statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large
variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes”
approach. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
An ISO 9001:2000 Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.19. Raw data for Common Mode Rejection Ratio 1 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 1 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.16E+02
1.13E+02
1.17E+02
1.79E+02
1.16E+02
1.16E+02
1.21E+02
1.17E+02
1.85E+02
1.19E+02
1.24E+02
10
1.13E+02
1.12E+02
1.15E+02
1.26E+02
1.14E+02
1.14E+02
1.19E+02
1.16E+02
1.34E+02
1.17E+02
1.25E+02
20
1.13E+02
1.12E+02
1.15E+02
1.23E+02
1.14E+02
1.13E+02
1.17E+02
1.14E+02
1.26E+02
1.16E+02
1.25E+02
30
1.13E+02
1.12E+02
1.16E+02
1.25E+02
1.13E+02
1.12E+02
1.17E+02
1.14E+02
1.23E+02
1.15E+02
1.26E+02
50
1.12E+02
1.12E+02
1.15E+02
1.23E+02
1.14E+02
1.12E+02
1.16E+02
1.14E+02
1.21E+02
1.14E+02
1.23E+02
60
1.13E+02
1.12E+02
1.14E+02
1.24E+02
1.14E+02
1.12E+02
1.15E+02
1.13E+02
1.21E+02
1.13E+02
1.26E+02
70
1.14E+02
1.12E+02
1.15E+02
1.27E+02
1.14E+02
1.13E+02
1.18E+02
1.15E+02
1.26E+02
1.15E+02
1.24E+02
1.28E+02
2.82E+01
2.60E+02
-3.49E+00
1.16E+02
5.73E+00
1.43E+02
8.94E+01
1.15E+02
4.44E+00
1.36E+02
9.45E+01
1.16E+02
5.08E+00
1.40E+02
9.21E+01
1.15E+02
4.58E+00
1.36E+02
9.37E+01
1.15E+02
4.70E+00
1.37E+02
9.34E+01
1.16E+02
5.98E+00
1.44E+02
8.84E+01
1.31E+02
3.00E+01
2.71E+02
-8.47E+00
9.70E+01
FAIL
1.20E+02
7.90E+00
1.57E+02
8.32E+01
9.70E+01
FAIL
1.17E+02
4.97E+00
1.40E+02
9.40E+01
9.70E+01
FAIL
1.16E+02
4.20E+00
1.36E+02
9.66E+01
9.70E+01
FAIL
1.15E+02
3.61E+00
1.32E+02
9.85E+01
9.40E+01
FAIL
1.15E+02
3.87E+00
1.33E+02
9.69E+01
9.40E+01
FAIL
1.17E+02
4.99E+00
1.41E+02
9.40E+01
9.40E+01
FAIL
An ISO 9001:2000 Certified Company
45
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 2 (dB)
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.20. Plot of Common Mode Rejection Ratio 2 (dB) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.20. Raw data for Common Mode Rejection Ratio 2 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 2 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.15E+02
1.18E+02
1.15E+02
1.14E+02
1.19E+02
1.16E+02
1.14E+02
1.15E+02
1.13E+02
1.15E+02
1.29E+02
10
1.14E+02
1.16E+02
1.14E+02
1.13E+02
1.16E+02
1.15E+02
1.15E+02
1.14E+02
1.12E+02
1.14E+02
1.32E+02
20
1.13E+02
1.16E+02
1.13E+02
1.13E+02
1.16E+02
1.14E+02
1.16E+02
1.14E+02
1.12E+02
1.13E+02
1.34E+02
30
1.14E+02
1.16E+02
1.14E+02
1.12E+02
1.15E+02
1.13E+02
1.17E+02
1.13E+02
1.11E+02
1.13E+02
1.32E+02
50
1.13E+02
1.15E+02
1.13E+02
1.12E+02
1.15E+02
1.13E+02
1.18E+02
1.12E+02
1.11E+02
1.12E+02
1.32E+02
60
1.13E+02
1.15E+02
1.13E+02
1.12E+02
1.15E+02
1.12E+02
1.18E+02
1.13E+02
1.11E+02
1.12E+02
1.30E+02
70
1.14E+02
1.16E+02
1.14E+02
1.12E+02
1.16E+02
1.14E+02
1.16E+02
1.14E+02
1.12E+02
1.13E+02
1.31E+02
1.16E+02
2.17E+00
1.26E+02
1.06E+02
1.14E+02
1.51E+00
1.21E+02
1.07E+02
1.14E+02
1.46E+00
1.21E+02
1.07E+02
1.14E+02
1.51E+00
1.21E+02
1.07E+02
1.14E+02
1.29E+00
1.20E+02
1.08E+02
1.14E+02
1.41E+00
1.20E+02
1.07E+02
1.14E+02
1.38E+00
1.21E+02
1.08E+02
1.15E+02
1.10E+00
1.20E+02
1.09E+02
9.70E+01
PASS
1.14E+02
1.27E+00
1.20E+02
1.08E+02
9.70E+01
PASS
1.14E+02
1.76E+00
1.22E+02
1.05E+02
9.70E+01
PASS
1.13E+02
2.09E+00
1.23E+02
1.04E+02
9.70E+01
PASS
1.13E+02
2.93E+00
1.27E+02
9.94E+01
9.40E+01
PASS
1.13E+02
2.80E+00
1.26E+02
1.00E+02
9.40E+01
PASS
1.13E+02
1.53E+00
1.21E+02
1.06E+02
9.40E+01
PASS
An ISO 9001:2000 Certified Company
47
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
1.30E+02
Common Mode Rejection Ratio 3 (dB)
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.21. Plot of Common Mode Rejection Ratio 3 (dB) versus total dose. The data show some
degradation with radiation, however it is not sufficient for the measured parameter to fall below specification.
Note that the testing and statistics used in this figure are based on an “analysis of variables” technique, which
relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of
statistical treatments). Unfortunately, this parameter is not well suited to this approach due to inherent large
variations. If necessary, larger samples sizes could be used to qualify this parameter using an “attributes”
approach.. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
An ISO 9001:2000 Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.21. Raw data for Common Mode Rejection Ratio 3 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 3 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.19E+02
1.23E+02
1.17E+02
1.17E+02
1.21E+02
1.12E+02
1.22E+02
1.25E+02
1.18E+02
1.13E+02
1.18E+02
10
1.15E+02
1.18E+02
1.14E+02
1.15E+02
1.18E+02
1.11E+02
1.21E+02
1.22E+02
1.17E+02
1.13E+02
1.18E+02
20
1.15E+02
1.18E+02
1.14E+02
1.15E+02
1.17E+02
1.11E+02
1.19E+02
1.20E+02
1.16E+02
1.12E+02
1.17E+02
30
1.14E+02
1.18E+02
1.14E+02
1.15E+02
1.18E+02
1.10E+02
1.18E+02
1.19E+02
1.15E+02
1.11E+02
1.17E+02
50
1.15E+02
1.17E+02
1.14E+02
1.13E+02
1.16E+02
1.10E+02
1.18E+02
1.17E+02
1.14E+02
1.10E+02
1.17E+02
60
1.15E+02
1.17E+02
1.14E+02
1.13E+02
1.17E+02
1.09E+02
1.18E+02
1.18E+02
1.14E+02
1.11E+02
1.17E+02
70
1.15E+02
1.19E+02
1.13E+02
1.16E+02
1.18E+02
1.10E+02
1.18E+02
1.19E+02
1.15E+02
1.11E+02
1.18E+02
1.19E+02
2.42E+00
1.31E+02
1.08E+02
1.16E+02
1.92E+00
1.25E+02
1.07E+02
1.16E+02
1.74E+00
1.24E+02
1.08E+02
1.16E+02
1.95E+00
1.25E+02
1.07E+02
1.15E+02
1.43E+00
1.22E+02
1.08E+02
1.15E+02
1.62E+00
1.23E+02
1.08E+02
1.16E+02
2.20E+00
1.27E+02
1.06E+02
1.18E+02
5.62E+00
1.44E+02
9.16E+01
9.70E+01
FAIL
1.17E+02
4.68E+00
1.39E+02
9.49E+01
9.70E+01
FAIL
1.15E+02
4.23E+00
1.35E+02
9.57E+01
9.70E+01
FAIL
1.15E+02
3.98E+00
1.33E+02
9.60E+01
9.70E+01
FAIL
1.14E+02
3.79E+00
1.31E+02
9.60E+01
9.40E+01
PASS
1.14E+02
3.93E+00
1.32E+02
9.55E+01
9.40E+01
PASS
1.15E+02
3.93E+00
1.33E+02
9.65E+01
9.40E+01
PASS
An ISO 9001:2000 Certified Company
49
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 4 (dB)
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.22. Plot of Common Mode Rejection Ratio 4 (dB) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.22. Raw data for Common Mode Rejection Ratio 4 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 4 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.11E+02
1.12E+02
1.11E+02
1.18E+02
1.16E+02
1.12E+02
1.12E+02
1.14E+02
1.17E+02
1.15E+02
1.23E+02
10
1.10E+02
1.11E+02
1.10E+02
1.15E+02
1.14E+02
1.11E+02
1.11E+02
1.13E+02
1.17E+02
1.15E+02
1.23E+02
20
1.10E+02
1.12E+02
1.10E+02
1.15E+02
1.14E+02
1.10E+02
1.11E+02
1.12E+02
1.16E+02
1.15E+02
1.22E+02
30
1.10E+02
1.11E+02
1.10E+02
1.15E+02
1.14E+02
1.10E+02
1.10E+02
1.11E+02
1.16E+02
1.14E+02
1.23E+02
50
1.10E+02
1.11E+02
1.10E+02
1.14E+02
1.13E+02
1.10E+02
1.10E+02
1.10E+02
1.14E+02
1.13E+02
1.21E+02
60
1.10E+02
1.11E+02
1.10E+02
1.15E+02
1.13E+02
1.09E+02
1.10E+02
1.11E+02
1.14E+02
1.14E+02
1.22E+02
70
1.10E+02
1.11E+02
1.10E+02
1.16E+02
1.14E+02
1.10E+02
1.11E+02
1.12E+02
1.16E+02
1.15E+02
1.23E+02
1.14E+02
2.97E+00
1.28E+02
9.99E+01
1.12E+02
2.50E+00
1.24E+02
1.00E+02
1.12E+02
2.36E+00
1.23E+02
1.01E+02
1.12E+02
2.20E+00
1.22E+02
1.02E+02
1.11E+02
2.10E+00
1.21E+02
1.02E+02
1.12E+02
2.36E+00
1.23E+02
1.01E+02
1.12E+02
2.65E+00
1.24E+02
9.97E+01
1.14E+02
1.96E+00
1.23E+02
1.05E+02
9.70E+01
PASS
1.13E+02
2.56E+00
1.25E+02
1.01E+02
9.70E+01
PASS
1.13E+02
2.55E+00
1.25E+02
1.01E+02
9.70E+01
PASS
1.12E+02
2.48E+00
1.24E+02
1.01E+02
9.70E+01
PASS
1.12E+02
1.97E+00
1.21E+02
1.02E+02
9.40E+01
PASS
1.12E+02
2.06E+00
1.21E+02
1.02E+02
9.40E+01
PASS
1.13E+02
2.56E+00
1.25E+02
1.01E+02
9.40E+01
PASS
An ISO 9001:2000 Certified Company
51
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Power Supply Rejection Ratio 1 (dB)
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.23. Plot of Power Supply Rejection Ratio 1 (dB) versus total dose. The data show no significant
degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of
variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814,
p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.23. Raw data for Power Supply Rejection Ratio 1 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 1 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.33E+02
1.29E+02
1.29E+02
1.33E+02
1.45E+02
1.31E+02
1.26E+02
1.26E+02
1.27E+02
1.39E+02
1.32E+02
10
1.53E+02
1.30E+02
1.28E+02
1.36E+02
1.32E+02
1.46E+02
1.31E+02
1.27E+02
1.26E+02
1.38E+02
1.38E+02
20
1.28E+02
1.30E+02
1.24E+02
1.34E+02
1.32E+02
1.36E+02
1.28E+02
1.23E+02
1.33E+02
1.57E+02
1.26E+02
30
1.56E+02
1.31E+02
1.32E+02
1.33E+02
1.33E+02
1.39E+02
1.39E+02
1.27E+02
1.43E+02
1.33E+02
1.31E+02
50
1.33E+02
1.36E+02
1.28E+02
1.41E+02
1.46E+02
1.40E+02
1.27E+02
1.28E+02
1.38E+02
1.45E+02
1.33E+02
60
1.26E+02
1.26E+02
1.24E+02
1.37E+02
1.42E+02
1.34E+02
1.28E+02
1.25E+02
1.32E+02
1.27E+02
1.26E+02
70
1.27E+02
1.32E+02
1.27E+02
1.37E+02
1.33E+02
1.30E+02
1.35E+02
1.28E+02
1.31E+02
1.43E+02
1.31E+02
1.34E+02
6.52E+00
1.64E+02
1.03E+02
1.36E+02
1.01E+01
1.83E+02
8.88E+01
1.29E+02
3.99E+00
1.48E+02
1.11E+02
1.37E+02
1.08E+01
1.88E+02
8.65E+01
1.37E+02
7.12E+00
1.70E+02
1.04E+02
1.31E+02
8.14E+00
1.69E+02
9.28E+01
1.31E+02
4.48E+00
1.52E+02
1.10E+02
1.30E+02
5.78E+00
1.57E+02
1.03E+02
1.00E+02
PASS
1.33E+02
8.33E+00
1.72E+02
9.46E+01
1.00E+02
FAIL
1.35E+02
1.28E+01
1.95E+02
7.58E+01
9.80E+01
FAIL
1.36E+02
6.14E+00
1.65E+02
1.08E+02
9.80E+01
FAIL
1.35E+02
7.97E+00
1.73E+02
9.83E+01
9.40E+01
PASS
1.29E+02
3.82E+00
1.47E+02
1.12E+02
9.40E+01
FAIL
1.33E+02
5.75E+00
1.60E+02
1.06E+02
9.40E+01
PASS
An ISO 9001:2000 Certified Company
53
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
1.60E+02
Power Supply Rejection Ratio 2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.24. Plot of Power Supply Rejection Ratio 2 (dB) versus total dose. The data show no significant
degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of
variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814,
p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.24. Raw data for Power Supply Rejection Ratio 2 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 2 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.34E+02
1.33E+02
1.36E+02
1.36E+02
1.49E+02
1.27E+02
1.16E+02
1.14E+02
1.33E+02
1.32E+02
1.23E+02
10
1.33E+02
1.30E+02
1.31E+02
1.41E+02
1.44E+02
1.32E+02
1.15E+02
1.14E+02
1.36E+02
1.30E+02
1.23E+02
20
1.40E+02
1.32E+02
1.29E+02
1.43E+02
1.62E+02
1.31E+02
1.14E+02
1.14E+02
1.41E+02
1.29E+02
1.21E+02
30
1.34E+02
1.29E+02
1.31E+02
1.47E+02
1.45E+02
1.31E+02
1.14E+02
1.14E+02
1.43E+02
1.26E+02
1.22E+02
50
1.33E+02
1.28E+02
1.29E+02
1.51E+02
1.47E+02
1.33E+02
1.13E+02
1.14E+02
1.61E+02
1.27E+02
1.23E+02
60
1.35E+02
1.30E+02
1.30E+02
1.65E+02
1.42E+02
1.36E+02
1.13E+02
1.13E+02
1.42E+02
1.25E+02
1.22E+02
70
1.38E+02
1.29E+02
1.33E+02
1.47E+02
1.81E+02
1.29E+02
1.13E+02
1.13E+02
1.34E+02
1.26E+02
1.23E+02
1.38E+02
6.53E+00
1.68E+02
1.07E+02
1.36E+02
6.13E+00
1.64E+02
1.07E+02
1.41E+02
1.31E+01
2.03E+02
8.01E+01
1.37E+02
8.25E+00
1.76E+02
9.86E+01
1.38E+02
1.09E+01
1.88E+02
8.70E+01
1.40E+02
1.46E+01
2.08E+02
7.23E+01
1.45E+02
2.10E+01
2.43E+02
4.76E+01
1.24E+02
8.94E+00
1.66E+02
8.25E+01
1.00E+02
FAIL
1.25E+02
1.01E+01
1.72E+02
7.84E+01
1.00E+02
FAIL
1.26E+02
1.16E+01
1.80E+02
7.16E+01
9.80E+01
FAIL
1.25E+02
1.23E+01
1.83E+02
6.83E+01
9.80E+01
FAIL
1.30E+02
1.97E+01
2.21E+02
3.78E+01
9.40E+01
FAIL
1.26E+02
1.32E+01
1.88E+02
6.45E+01
9.40E+01
FAIL
1.23E+02
9.32E+00
1.67E+02
7.96E+01
9.40E+01
FAIL
An ISO 9001:2000 Certified Company
55
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
1.60E+02
Power Supply Rejection Ratio 3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.25. Plot of Power Supply Rejection Ratio 3 (dB) versus total dose. The data show no significant
degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of
variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814,
p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.25. Raw data for Power Supply Rejection Ratio 3 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 3 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.38E+02
1.42E+02
1.20E+02
1.28E+02
1.54E+02
1.55E+02
1.17E+02
1.25E+02
1.22E+02
1.31E+02
1.35E+02
10
1.40E+02
1.39E+02
1.19E+02
1.30E+02
1.57E+02
1.28E+02
1.20E+02
1.26E+02
1.24E+02
1.35E+02
1.55E+02
20
1.31E+02
1.44E+02
1.17E+02
1.65E+02
1.34E+02
1.31E+02
1.17E+02
1.20E+02
1.26E+02
1.47E+02
1.30E+02
30
1.41E+02
1.38E+02
1.20E+02
1.37E+02
1.31E+02
1.31E+02
1.19E+02
1.27E+02
1.30E+02
1.52E+02
1.39E+02
50
1.38E+02
1.41E+02
1.17E+02
1.33E+02
1.44E+02
1.42E+02
1.17E+02
1.27E+02
1.32E+02
1.34E+02
1.39E+02
60
1.36E+02
1.43E+02
1.17E+02
1.30E+02
1.44E+02
1.26E+02
1.17E+02
1.23E+02
1.28E+02
1.30E+02
1.36E+02
70
1.35E+02
1.43E+02
1.19E+02
1.69E+02
1.48E+02
1.62E+02
1.18E+02
1.23E+02
1.23E+02
1.38E+02
1.44E+02
1.36E+02
1.29E+01
1.96E+02
7.61E+01
1.37E+02
1.39E+01
2.02E+02
7.21E+01
1.38E+02
1.78E+01
2.21E+02
5.48E+01
1.33E+02
8.45E+00
1.73E+02
9.38E+01
1.35E+02
1.05E+01
1.84E+02
8.57E+01
1.34E+02
1.08E+01
1.84E+02
8.33E+01
1.43E+02
1.83E+01
2.28E+02
5.73E+01
1.30E+02
1.51E+01
2.01E+02
5.93E+01
1.00E+02
FAIL
1.27E+02
5.64E+00
1.53E+02
1.00E+02
1.00E+02
FAIL
1.28E+02
1.17E+01
1.83E+02
7.37E+01
9.80E+01
FAIL
1.32E+02
1.25E+01
1.90E+02
7.36E+01
9.80E+01
FAIL
1.31E+02
9.38E+00
1.74E+02
8.68E+01
9.40E+01
FAIL
1.25E+02
5.07E+00
1.48E+02
1.01E+02
9.40E+01
FAIL
1.32E+02
1.80E+01
2.16E+02
4.87E+01
9.40E+01
FAIL
An ISO 9001:2000 Certified Company
57
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Power Supply Rejection Ratio 4 (dB)
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.26. Plot of Power Supply Rejection Ratio 4 (dB) versus total dose. The data show no significant
degradation with radiation. Note that the testing and statistics used in this figure are based on an “analysis of
variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814,
p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.26. Raw data for Power Supply Rejection Ratio 4 (dB) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 4 (dB)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.23E+02
1.25E+02
1.66E+02
1.41E+02
1.30E+02
1.26E+02
1.31E+02
1.35E+02
1.34E+02
1.37E+02
1.23E+02
10
1.32E+02
1.25E+02
1.30E+02
1.71E+02
1.26E+02
1.33E+02
1.35E+02
1.37E+02
1.29E+02
1.31E+02
1.25E+02
20
1.25E+02
1.26E+02
1.28E+02
1.28E+02
1.24E+02
1.28E+02
1.36E+02
1.48E+02
1.33E+02
1.28E+02
1.21E+02
30
1.31E+02
1.28E+02
1.54E+02
1.30E+02
1.27E+02
1.31E+02
1.45E+02
1.32E+02
1.34E+02
1.28E+02
1.22E+02
50
1.29E+02
1.26E+02
1.28E+02
1.29E+02
1.26E+02
1.30E+02
1.33E+02
1.32E+02
1.33E+02
1.31E+02
1.25E+02
60
1.23E+02
1.25E+02
1.36E+02
1.38E+02
1.31E+02
1.44E+02
1.31E+02
1.40E+02
1.41E+02
1.24E+02
1.21E+02
70
1.22E+02
1.22E+02
1.36E+02
1.28E+02
1.25E+02
1.24E+02
1.45E+02
1.32E+02
1.33E+02
1.32E+02
1.22E+02
1.37E+02
1.75E+01
2.19E+02
5.55E+01
1.37E+02
1.95E+01
2.28E+02
4.57E+01
1.26E+02
1.56E+00
1.33E+02
1.19E+02
1.34E+02
1.11E+01
1.86E+02
8.21E+01
1.28E+02
1.37E+00
1.34E+02
1.21E+02
1.31E+02
6.72E+00
1.62E+02
9.93E+01
1.27E+02
5.66E+00
1.53E+02
1.00E+02
1.32E+02
4.44E+00
1.53E+02
1.12E+02
1.00E+02
FAIL
1.33E+02
2.96E+00
1.47E+02
1.19E+02
1.00E+02
FAIL
1.35E+02
8.39E+00
1.74E+02
9.55E+01
9.80E+01
FAIL
1.34E+02
6.39E+00
1.64E+02
1.04E+02
9.80E+01
FAIL
1.32E+02
1.37E+00
1.38E+02
1.25E+02
9.40E+01
PASS
1.36E+02
8.27E+00
1.74E+02
9.72E+01
9.40E+01
PASS
1.33E+02
7.78E+00
1.70E+02
9.70E+01
9.40E+01
PASS
An ISO 9001:2000 Certified Company
59
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Open Loop Gain 9 RL=10k VO=+/-10V (V/mV)
3.00E+04
2.00E+04
1.00E+04
0.00E+00
-1.00E+04
-2.00E+04
-3.00E+04
-4.00E+04
-5.00E+04
-6.00E+04
-7.00E+04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.27. Plot of Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) versus total dose. The data show
significant degradation with radiation, however not sufficient for the average of the measured data to fall
below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis
of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
An ISO 9001:2000 Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.27. Raw data for Open Loop Gain 9 RL=10k VO=+/-10V (V/mV) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Open Loop Gain 9 RL=10k VO=+/-10V (V/mV)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.98E+04
1.26E+04
1.52E+04
5.10E+04
2.51E+04
6.29E+03
1.55E+04
1.12E+04
1.29E+04
3.99E+04
1.08E+04
10
1.03E+04
1.27E+04
1.30E+04
4.68E+04
5.05E+03
1.15E+04
4.02E+04
1.16E+04
1.69E+04
1.08E+04
1.76E+04
20
9.69E+03
6.06E+03
5.31E+03
3.17E+04
6.44E+03
5.52E+03
3.08E+04
1.06E+04
9.33E+03
1.35E+04
6.38E+04
30
6.68E+03
8.91E+03
5.62E+03
7.62E+03
4.73E+03
3.72E+03
2.11E+04
6.67E+03
7.74E+03
8.76E+03
2.68E+05
50
4.24E+03
6.23E+03
2.92E+03
5.28E+03
3.46E+03
4.51E+03
9.22E+03
4.07E+03
5.86E+03
9.06E+03
3.23E+04
60
5.08E+03
4.98E+03
2.78E+03
4.49E+03
2.94E+03
3.21E+03
6.42E+03
3.97E+03
7.53E+03
6.11E+03
1.05E+04
70
4.21E+03
6.25E+03
3.45E+03
4.11E+03
3.74E+03
4.67E+03
1.51E+04
5.76E+03
6.36E+03
2.34E+04
3.28E+05
2.47E+04
1.54E+04
9.67E+04
-4.72E+04
1.76E+04
1.66E+04
9.52E+04
-6.01E+04
1.18E+04
1.12E+04
6.43E+04
-4.06E+04
6.71E+03
1.64E+03
1.44E+04
-9.51E+02
4.43E+03
1.34E+03
1.07E+04
-1.84E+03
4.06E+03
1.11E+03
9.25E+03
-1.14E+03
4.35E+03
1.10E+03
9.49E+03
-7.94E+02
1.72E+04
1.31E+04
7.85E+04
-4.41E+04
1.20E+03
FAIL
1.82E+04
1.25E+04
7.67E+04
-4.02E+04
5.00E+02
FAIL
1.40E+04
9.85E+03
5.99E+04
-3.20E+04
2.00E+02
FAIL
9.60E+03
6.72E+03
4.09E+04
-2.17E+04
2.00E+02
FAIL
6.54E+03
2.46E+03
1.80E+04
-4.94E+03
1.00E+02
FAIL
5.45E+03
1.80E+03
1.38E+04
-2.93E+03
1.00E+02
FAIL
1.10E+04
8.04E+03
4.86E+04
-2.65E+04
1.00E+02
FAIL
An ISO 9001:2000 Certified Company
61
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Open Loop Gain 10 RL=10k VO=+/-10V
(V/mV)
5.00E+04
0.00E+00
-5.00E+04
-1.00E+05
-1.50E+05
-2.00E+05
-2.50E+05
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.28. Plot of Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) versus total dose. The data show
significant degradation with radiation, however not sufficient for the average of the measured data to fall
below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis
of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
An ISO 9001:2000 Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.28. Raw data for Open Loop Gain 10 RL=10k VO=+/-10V (V/mV) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Open Loop Gain 10 RL=10k VO=+/-10V (V/mV)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.61E+04
3.10E+04
2.65E+04
7.36E+03
1.51E+04
8.53E+03
7.65E+03
1.16E+05
1.12E+04
1.24E+04
1.28E+05
10
3.74E+04
1.65E+04
2.46E+04
6.95E+03
1.88E+04
6.29E+03
9.12E+03
2.92E+04
5.77E+03
1.37E+04
6.53E+05
20
1.11E+04
1.86E+04
3.23E+04
5.27E+03
7.17E+03
6.07E+03
7.88E+03
1.93E+04
6.59E+03
7.74E+03
1.59E+05
30
9.42E+03
8.61E+03
7.21E+04
5.61E+03
5.99E+03
4.95E+03
1.02E+04
2.96E+04
7.09E+03
5.68E+03
6.42E+05
50
6.24E+03
5.69E+03
4.36E+04
3.25E+03
3.87E+03
3.69E+03
1.23E+04
1.21E+04
3.52E+03
4.24E+03
6.23E+04
60
5.26E+03
5.12E+03
2.51E+04
3.38E+03
4.38E+03
5.06E+03
7.64E+03
1.11E+04
3.61E+03
4.55E+03
7.71E+04
70
5.30E+03
4.96E+03
1.87E+04
3.65E+03
3.86E+03
4.11E+03
1.39E+04
1.45E+04
3.89E+03
4.08E+03
1.82E+05
2.12E+04
9.70E+03
6.65E+04
-2.41E+04
2.08E+04
1.12E+04
7.33E+04
-3.16E+04
1.49E+04
1.10E+04
6.61E+04
-3.63E+04
2.03E+04
2.90E+04
1.56E+05
-1.15E+05
1.25E+04
1.74E+04
9.38E+04
-6.87E+04
8.65E+03
9.23E+03
5.17E+04
-3.44E+04
7.29E+03
6.43E+03
3.73E+04
-2.27E+04
3.11E+04
4.74E+04
2.52E+05
-1.90E+05
1.20E+03
FAIL
1.28E+04
9.67E+03
5.79E+04
-3.23E+04
5.00E+02
FAIL
9.52E+03
5.52E+03
3.53E+04
-1.63E+04
2.00E+02
FAIL
1.15E+04
1.03E+04
5.97E+04
-3.67E+04
2.00E+02
FAIL
7.15E+03
4.58E+03
2.85E+04
-1.42E+04
1.00E+02
FAIL
6.38E+03
3.01E+03
2.04E+04
-7.65E+03
1.00E+02
FAIL
8.10E+03
5.58E+03
3.41E+04
-1.79E+04
1.00E+02
FAIL
An ISO 9001:2000 Certified Company
63
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Open Loop Gain 11 RL=10k VO=+/-10V (V/mV)
5.00E+04
0.00E+00
-5.00E+04
-1.00E+05
-1.50E+05
-2.00E+05
-2.50E+05
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.29. Plot of Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) versus total dose. The data show
significant degradation with radiation, however not sufficient for the average of the measured data to fall
below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis
of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
An ISO 9001:2000 Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.29. Raw data for Open Loop Gain 11 RL=10k VO=+/-10V (V/mV) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Open Loop Gain 11 RL=10k VO=+/-10V (V/mV)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.58E+04
3.69E+04
1.19E+04
6.66E+04
2.82E+04
6.04E+03
2.50E+04
1.22E+05
8.40E+03
1.14E+04
1.98E+04
10
1.54E+04
2.05E+04
1.84E+04
2.01E+04
8.51E+03
9.28E+03
2.10E+04
2.23E+04
7.01E+03
5.55E+03
1.45E+04
20
2.48E+04
1.29E+04
8.35E+04
1.53E+04
9.11E+03
6.97E+03
2.56E+04
6.21E+04
6.45E+03
5.58E+03
4.70E+04
30
4.80E+03
7.42E+03
6.23E+04
5.68E+03
7.38E+03
4.11E+03
1.46E+04
9.74E+04
4.07E+03
5.00E+03
2.94E+04
50
5.08E+03
8.42E+03
1.87E+04
4.17E+03
5.07E+03
4.46E+03
1.15E+05
2.08E+04
3.48E+03
3.55E+03
1.49E+04
60
8.06E+03
6.03E+03
1.27E+04
3.42E+03
3.37E+03
3.29E+03
1.38E+04
1.38E+04
4.74E+03
3.51E+03
2.02E+04
70
5.99E+03
6.06E+03
6.29E+03
3.11E+03
5.09E+03
5.45E+03
2.00E+04
1.41E+04
4.01E+03
4.98E+03
2.92E+04
3.19E+04
2.18E+04
1.34E+05
-6.99E+04
1.66E+04
4.93E+03
3.96E+04
-6.46E+03
2.91E+04
3.09E+04
1.73E+05
-1.15E+05
1.75E+04
2.50E+04
1.34E+05
-9.93E+04
8.29E+03
6.04E+03
3.64E+04
-1.99E+04
6.72E+03
3.89E+03
2.49E+04
-1.14E+04
5.30E+03
1.31E+03
1.14E+04
-8.16E+02
3.45E+04
4.93E+04
2.64E+05
-1.95E+05
1.20E+03
FAIL
1.30E+04
8.00E+03
5.03E+04
-2.43E+04
5.00E+02
FAIL
2.13E+04
2.43E+04
1.35E+05
-9.19E+04
2.00E+02
FAIL
2.50E+04
4.07E+04
2.15E+05
-1.65E+05
2.00E+02
FAIL
2.95E+04
4.85E+04
2.56E+05
-1.97E+05
1.00E+02
FAIL
7.82E+03
5.47E+03
3.33E+04
-1.77E+04
1.00E+02
FAIL
9.70E+03
7.02E+03
4.25E+04
-2.31E+04
1.00E+02
FAIL
An ISO 9001:2000 Certified Company
65
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Open Loop Gain 12 RL=10k VO=+/-10V (V/mV)
4.00E+05
2.00E+05
0.00E+00
-2.00E+05
-4.00E+05
-6.00E+05
-8.00E+05
-1.00E+06
-1.20E+06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.30. Plot of Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) versus total dose. The data show
significant degradation with radiation, however not sufficient for the average of the measured data to fall
below the specification limit. Note that the testing and statistics used in this figure are based on an “analysis
of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK814, p. 91 for a discussion of statistical treatments). Unfortunately, this parameter is not well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify this
parameter using an “attributes” approach. The solid diamonds are the average of measured data points from
the biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from
the unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
An ISO 9001:2000 Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.30. Raw data for Open Loop Gain 12 RL=10k VO=+/-10V (V/mV) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Open Loop Gain 12 RL=10k VO=+/-10V (V/mV)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
7.88E+03
3.20E+04
6.67E+03
1.10E+04
1.12E+04
1.59E+04
5.41E+05
1.73E+04
9.54E+04
5.67E+05
2.69E+04
10
4.05E+04
2.04E+04
1.08E+04
9.47E+03
1.25E+04
5.04E+03
1.33E+04
8.03E+03
7.12E+03
1.30E+04
1.71E+04
20
1.11E+04
2.18E+04
1.46E+04
8.26E+03
1.00E+04
6.34E+03
9.51E+03
1.14E+04
5.74E+03
1.26E+04
2.99E+05
30
1.95E+04
8.58E+03
4.46E+03
6.83E+03
4.32E+03
4.42E+03
7.13E+03
8.00E+03
1.14E+04
1.43E+04
1.43E+05
50
4.98E+03
4.50E+03
3.28E+03
5.92E+03
3.93E+03
4.14E+03
6.60E+03
5.31E+03
7.13E+03
7.89E+03
1.64E+04
60
3.60E+03
5.62E+03
3.57E+03
5.09E+03
3.87E+03
4.03E+03
1.39E+04
6.21E+03
4.34E+03
1.02E+04
1.12E+05
70
3.87E+03
4.77E+03
4.85E+03
4.75E+03
3.23E+03
3.49E+03
1.02E+04
1.08E+04
9.36E+03
8.96E+03
2.43E+04
1.38E+04
1.04E+04
6.22E+04
-3.47E+04
1.87E+04
1.29E+04
7.88E+04
-4.13E+04
1.31E+04
5.37E+03
3.82E+04
-1.19E+04
8.73E+03
6.26E+03
3.79E+04
-2.05E+04
4.52E+03
1.01E+03
9.22E+03
-1.75E+02
4.35E+03
9.42E+02
8.74E+03
-4.26E+01
4.29E+03
7.16E+02
7.63E+03
9.53E+02
2.47E+05
2.82E+05
1.56E+06
-1.07E+06
1.20E+03
FAIL
9.29E+03
3.67E+03
2.64E+04
-7.82E+03
5.00E+02
FAIL
9.13E+03
3.04E+03
2.33E+04
-5.05E+03
2.00E+02
FAIL
9.04E+03
3.85E+03
2.70E+04
-8.91E+03
2.00E+02
FAIL
6.21E+03
1.49E+03
1.32E+04
-7.55E+02
1.00E+02
FAIL
7.73E+03
4.24E+03
2.75E+04
-1.20E+04
1.00E+02
FAIL
8.57E+03
2.94E+03
2.23E+04
-5.13E+03
1.00E+02
FAIL
An ISO 9001:2000 Certified Company
67
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 1 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.31. Plot of Positive Output Voltage 1 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.31. Raw data for Positive Output Voltage 1 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 1 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
20
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
30
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
5.17E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
5.22E-03
1.41E+01
1.41E+01
1.41E+01
5.17E-03
1.41E+01
1.41E+01
1.41E+01
5.22E-03
1.41E+01
1.41E+01
1.41E+01
4.97E-03
1.41E+01
1.41E+01
1.41E+01
3.35E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.16E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
2.77E-03
1.41E+01
1.41E+01
1.25E+01
PASS
An ISO 9001:2000 Certified Company
69
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 2 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.32. Plot of Positive Output Voltage 2 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.32. Raw data for Positive Output Voltage 2 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 2 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
20
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
30
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
5.40E-03
1.41E+01
1.41E+01
1.41E+01
5.40E-03
1.41E+01
1.41E+01
1.41E+01
5.40E-03
1.41E+01
1.41E+01
1.41E+01
5.03E-03
1.41E+01
1.41E+01
1.41E+01
5.39E-03
1.41E+01
1.41E+01
1.41E+01
5.40E-03
1.41E+01
1.41E+01
1.41E+01
5.40E-03
1.41E+01
1.41E+01
1.41E+01
1.08E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
9.55E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.10E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.01E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.06E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.03E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.03E-02
1.41E+01
1.40E+01
1.25E+01
PASS
An ISO 9001:2000 Certified Company
71
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 3 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.33. Plot of Positive Output Voltage 3 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.33. Raw data for Positive Output Voltage 3 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 3 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
20
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
30
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
4.56E-03
1.41E+01
1.41E+01
1.41E+01
4.38E-03
1.41E+01
1.41E+01
1.41E+01
4.38E-03
1.41E+01
1.41E+01
1.41E+01
4.77E-03
1.41E+01
1.41E+01
1.41E+01
4.38E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
1.03E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.01E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.03E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.06E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.06E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.06E-02
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
1.04E-02
1.41E+01
1.40E+01
1.25E+01
PASS
An ISO 9001:2000 Certified Company
73
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 4 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.34. Plot of Positive Output Voltage 4 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.34. Raw data for Positive Output Voltage 4 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 4 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
20
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
30
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
4.45E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
4.45E-03
1.41E+01
1.41E+01
1.41E+01
4.44E-03
1.41E+01
1.41E+01
1.41E+01
4.45E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
4.60E-03
1.41E+01
1.41E+01
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.35E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.35E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.29E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.21E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.35E-03
1.41E+01
1.41E+01
1.25E+01
PASS
An ISO 9001:2000 Certified Company
75
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 1 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.35. Plot of Negative Output Voltage 1 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
76
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.35. Raw data for Negative Output Voltage 1 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 1 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
10
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
20
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
30
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
168-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
3.08E-03 3.08E-03 3.13E-03 2.83E-03 3.13E-03 3.29E-03 2.77E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01
1.64E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
2.00E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
2.51E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
An ISO 9001:2000 Certified Company
77
-1.44E+01
1.95E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
2.28E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 2 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.36. Plot of Negative Output Voltage 2 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
78
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.36. Raw data for Negative Output Voltage 2 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 2 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
10
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
20
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
30
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
168-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
5.81E-03 6.31E-03 6.54E-03 6.30E-03 6.34E-03 6.54E-03 6.02E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01
-1.44E+01
6.02E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.42E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.31E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.42E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
An ISO 9001:2000 Certified Company
79
-1.44E+01
6.63E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.63E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.23E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 3 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.37. Plot of Negative Output Voltage 3 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.37. Raw data for Negative Output Voltage 3 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 3 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
10
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
20
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
30
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
168-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
6.39E-03 6.43E-03 6.65E-03 6.39E-03 6.15E-03 6.44E-03 6.34E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.44E+01
-1.44E+01
6.54E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.72E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.84E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
6.87E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
An ISO 9001:2000 Certified Company
81
-1.44E+01
7.02E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
7.13E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
-1.44E+01
7.22E-03
-1.44E+01
-1.45E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 4 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.38. Plot of Negative Output Voltage 4 @ +/-15V (V) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
82
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.38. Raw data for Negative Output Voltage 4 @ +/-15V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 4 @ +/-15V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
10
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
20
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
30
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
168-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
2.61E-03 2.86E-03 2.97E-03 2.49E-03 2.49E-03 3.11E-03 2.45E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
2.51E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
An ISO 9001:2000 Certified Company
83
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
1.79E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
5.00E-01
Positive Slew Rate 1 @ +/-15V (V/us)
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.39. Plot of Positive Slew Rate 1 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
84
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.39. Raw data for Positive Slew Rate 1 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Slew Rate 1 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.97E-01
4.53E-01
4.38E-01
4.74E-01
4.39E-01
4.19E-01
4.60E-01
4.51E-01
4.67E-01
4.65E-01
4.74E-01
10
4.94E-01
4.49E-01
4.33E-01
4.70E-01
4.38E-01
4.25E-01
4.69E-01
4.48E-01
4.73E-01
4.69E-01
4.78E-01
20
4.99E-01
4.31E-01
4.31E-01
4.80E-01
4.40E-01
4.26E-01
4.57E-01
4.49E-01
4.62E-01
4.61E-01
4.74E-01
30
4.84E-01
4.43E-01
4.19E-01
4.69E-01
4.29E-01
4.12E-01
4.50E-01
4.39E-01
4.54E-01
4.62E-01
4.90E-01
50
4.66E-01
4.14E-01
4.03E-01
4.42E-01
4.17E-01
4.03E-01
4.36E-01
4.26E-01
4.41E-01
4.47E-01
4.66E-01
60
4.62E-01
4.26E-01
4.11E-01
4.50E-01
4.17E-01
4.04E-01
4.43E-01
4.23E-01
4.43E-01
4.50E-01
4.77E-01
70
4.75E-01
4.24E-01
4.03E-01
4.49E-01
4.12E-01
4.08E-01
4.45E-01
4.39E-01
4.61E-01
4.64E-01
4.76E-01
4.60E-01
2.52E-02
5.78E-01
3.43E-01
4.57E-01
2.52E-02
5.74E-01
3.39E-01
4.56E-01
3.13E-02
6.02E-01
3.10E-01
4.49E-01
2.72E-02
5.76E-01
3.22E-01
4.28E-01
2.54E-02
5.47E-01
3.10E-01
4.33E-01
2.19E-02
5.35E-01
3.31E-01
4.33E-01
2.93E-02
5.69E-01
2.96E-01
4.52E-01
1.97E-02
5.44E-01
3.61E-01
2.00E-01
PASS
4.57E-01
2.03E-02
5.52E-01
3.62E-01
1.30E-01
PASS
4.51E-01
1.49E-02
5.20E-01
3.82E-01
1.20E-01
PASS
4.43E-01
1.94E-02
5.34E-01
3.53E-01
1.20E-01
PASS
4.31E-01
1.72E-02
5.11E-01
3.50E-01
1.10E-01
PASS
4.33E-01
1.89E-02
5.21E-01
3.44E-01
1.10E-01
PASS
4.43E-01
2.24E-02
5.48E-01
3.39E-01
1.10E-01
PASS
An ISO 9001:2000 Certified Company
85
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 2 @ +/-15V (V/us)
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.40. Plot of Positive Slew Rate 2 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.40. Raw data for Positive Slew Rate 2 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Slew Rate 2 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.83E-01
4.84E-01
4.88E-01
4.48E-01
4.66E-01
4.73E-01
5.21E-01
5.11E-01
4.64E-01
4.46E-01
5.36E-01
10
4.74E-01
4.71E-01
4.83E-01
4.45E-01
4.61E-01
4.71E-01
5.18E-01
5.12E-01
4.62E-01
4.56E-01
5.43E-01
20
4.67E-01
4.77E-01
4.79E-01
4.45E-01
4.64E-01
4.72E-01
5.19E-01
5.03E-01
4.55E-01
4.53E-01
5.38E-01
30
4.61E-01
4.65E-01
4.76E-01
4.44E-01
4.56E-01
4.62E-01
5.12E-01
4.89E-01
4.52E-01
4.32E-01
5.34E-01
50
4.53E-01
4.49E-01
4.69E-01
4.23E-01
4.37E-01
4.45E-01
4.89E-01
4.83E-01
4.35E-01
4.28E-01
5.38E-01
60
4.54E-01
4.50E-01
4.57E-01
4.27E-01
4.42E-01
4.59E-01
4.93E-01
4.84E-01
4.40E-01
4.27E-01
5.28E-01
70
4.50E-01
4.44E-01
4.63E-01
4.32E-01
4.39E-01
4.56E-01
5.11E-01
4.95E-01
4.46E-01
4.35E-01
5.28E-01
4.74E-01
1.67E-02
5.52E-01
3.96E-01
4.67E-01
1.45E-02
5.34E-01
3.99E-01
4.66E-01
1.36E-02
5.30E-01
4.03E-01
4.60E-01
1.18E-02
5.15E-01
4.06E-01
4.46E-01
1.73E-02
5.27E-01
3.65E-01
4.46E-01
1.20E-02
5.02E-01
3.90E-01
4.46E-01
1.18E-02
5.00E-01
3.91E-01
4.83E-01
3.19E-02
6.32E-01
3.34E-01
2.00E-01
PASS
4.84E-01
2.91E-02
6.19E-01
3.48E-01
1.30E-01
PASS
4.80E-01
2.94E-02
6.18E-01
3.43E-01
1.20E-01
PASS
4.69E-01
3.14E-02
6.16E-01
3.23E-01
1.20E-01
PASS
4.56E-01
2.81E-02
5.87E-01
3.25E-01
1.10E-01
PASS
4.61E-01
2.81E-02
5.92E-01
3.30E-01
1.10E-01
PASS
4.69E-01
3.28E-02
6.21E-01
3.16E-01
1.10E-01
PASS
An ISO 9001:2000 Certified Company
87
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 3 @ +/-15V (V/us)
5.00E-01
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.41. Plot of Positive Slew Rate 3 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.41. Raw data for Positive Slew Rate 3 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Slew Rate 3 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.50E-01
4.45E-01
4.70E-01
4.29E-01
4.38E-01
4.48E-01
5.02E-01
4.76E-01
4.39E-01
4.27E-01
4.94E-01
10
4.54E-01
4.51E-01
4.70E-01
4.21E-01
4.30E-01
4.48E-01
5.09E-01
4.85E-01
4.40E-01
4.35E-01
5.11E-01
20
4.50E-01
4.55E-01
4.59E-01
4.21E-01
4.41E-01
4.44E-01
5.12E-01
4.71E-01
4.25E-01
4.19E-01
5.00E-01
30
4.45E-01
4.41E-01
4.49E-01
4.13E-01
4.28E-01
4.29E-01
4.97E-01
4.73E-01
4.23E-01
4.19E-01
5.03E-01
50
4.31E-01
4.25E-01
4.41E-01
4.03E-01
4.17E-01
4.22E-01
4.79E-01
4.53E-01
4.12E-01
4.06E-01
5.03E-01
60
4.23E-01
4.29E-01
4.33E-01
4.04E-01
4.18E-01
4.34E-01
4.94E-01
4.55E-01
4.19E-01
4.10E-01
5.01E-01
70
4.26E-01
4.26E-01
4.32E-01
4.03E-01
4.13E-01
4.35E-01
4.88E-01
4.57E-01
4.23E-01
4.12E-01
5.11E-01
4.46E-01
1.54E-02
5.18E-01
3.75E-01
4.45E-01
1.96E-02
5.37E-01
3.54E-01
4.45E-01
1.51E-02
5.16E-01
3.75E-01
4.35E-01
1.47E-02
5.04E-01
3.67E-01
4.23E-01
1.44E-02
4.90E-01
3.56E-01
4.21E-01
1.13E-02
4.74E-01
3.69E-01
4.20E-01
1.18E-02
4.75E-01
3.65E-01
4.58E-01
3.03E-02
6.00E-01
3.17E-01
2.00E-01
PASS
4.63E-01
3.22E-02
6.13E-01
3.13E-01
1.30E-01
PASS
4.54E-01
3.81E-02
6.32E-01
2.76E-01
1.20E-01
PASS
4.48E-01
3.48E-02
6.11E-01
2.86E-01
1.20E-01
PASS
4.34E-01
3.08E-02
5.78E-01
2.91E-01
1.10E-01
PASS
4.42E-01
3.35E-02
5.99E-01
2.86E-01
1.10E-01
PASS
4.43E-01
3.02E-02
5.84E-01
3.02E-01
1.10E-01
PASS
An ISO 9001:2000 Certified Company
89
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 4 @ +/-15V (V/us)
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.42. Plot of Positive Slew Rate 4 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.42. Raw data for Positive Slew Rate 4 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Slew Rate 4 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
5.33E-01
4.63E-01
4.61E-01
4.99E-01
4.70E-01
4.52E-01
4.97E-01
4.82E-01
4.98E-01
4.98E-01
4.96E-01
10
5.28E-01
4.59E-01
4.60E-01
4.87E-01
4.69E-01
4.45E-01
4.85E-01
4.77E-01
5.03E-01
4.99E-01
5.00E-01
20
5.32E-01
4.64E-01
4.62E-01
4.96E-01
4.62E-01
4.49E-01
4.90E-01
4.77E-01
4.98E-01
4.89E-01
5.11E-01
30
4.94E-01
4.57E-01
4.42E-01
4.86E-01
4.51E-01
4.35E-01
4.73E-01
4.63E-01
4.86E-01
4.84E-01
4.98E-01
50
5.01E-01
4.43E-01
4.30E-01
4.77E-01
4.39E-01
4.25E-01
4.57E-01
4.57E-01
4.75E-01
4.75E-01
4.95E-01
60
4.99E-01
4.43E-01
4.31E-01
4.72E-01
4.44E-01
4.25E-01
4.64E-01
4.58E-01
4.62E-01
4.68E-01
5.00E-01
70
5.08E-01
4.40E-01
4.35E-01
4.83E-01
4.46E-01
4.34E-01
4.67E-01
4.59E-01
4.79E-01
4.82E-01
5.00E-01
4.85E-01
3.08E-02
6.29E-01
3.42E-01
4.81E-01
2.88E-02
6.15E-01
3.46E-01
4.83E-01
3.09E-02
6.27E-01
3.39E-01
4.66E-01
2.27E-02
5.72E-01
3.60E-01
4.58E-01
2.99E-02
5.98E-01
3.18E-01
4.58E-01
2.75E-02
5.86E-01
3.29E-01
4.62E-01
3.17E-02
6.10E-01
3.14E-01
4.85E-01
1.99E-02
5.78E-01
3.93E-01
2.00E-01
PASS
4.82E-01
2.31E-02
5.90E-01
3.74E-01
1.30E-01
PASS
4.81E-01
1.92E-02
5.70E-01
3.91E-01
1.20E-01
PASS
4.68E-01
2.07E-02
5.65E-01
3.71E-01
1.20E-01
PASS
4.58E-01
2.04E-02
5.53E-01
3.62E-01
1.10E-01
PASS
4.55E-01
1.74E-02
5.36E-01
3.74E-01
1.10E-01
PASS
4.64E-01
1.93E-02
5.54E-01
3.74E-01
1.10E-01
PASS
An ISO 9001:2000 Certified Company
91
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Ps99%/90% (+KTL) Biased
Negative Slew Rate 1 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.43. Plot of Negative Slew Rate 1 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.43. Raw data for Negative Slew Rate 1 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Slew Rate 1 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-5.47E-01
-5.07E-01
-4.90E-01
-5.24E-01
-4.92E-01
-4.61E-01
-5.19E-01
-4.91E-01
-5.22E-01
-5.38E-01
-5.27E-01
10
-5.57E-01
-4.94E-01
-4.84E-01
-5.28E-01
-4.82E-01
-4.70E-01
-5.18E-01
-5.05E-01
-5.19E-01
-5.24E-01
-5.43E-01
20
-5.61E-01
-4.85E-01
-4.71E-01
-5.22E-01
-4.90E-01
-4.62E-01
-5.20E-01
-5.08E-01
-5.13E-01
-5.13E-01
-5.46E-01
30
-5.45E-01
-4.79E-01
-4.62E-01
-5.23E-01
-4.71E-01
-4.60E-01
-4.97E-01
-4.93E-01
-5.12E-01
-5.13E-01
-5.28E-01
50
-5.24E-01
-4.76E-01
-4.39E-01
-4.96E-01
-4.64E-01
-4.52E-01
-4.96E-01
-4.80E-01
-4.95E-01
-4.89E-01
-5.30E-01
60
-5.12E-01
-4.64E-01
-4.44E-01
-5.24E-01
-4.60E-01
-4.44E-01
-4.96E-01
-4.74E-01
-5.04E-01
-4.93E-01
-5.29E-01
70
-5.15E-01
-4.64E-01
-4.54E-01
-4.98E-01
-4.54E-01
-4.42E-01
-5.06E-01
-5.00E-01
-5.05E-01
-4.99E-01
-5.35E-01
-5.12E-01
2.39E-02
-4.01E-01
-6.23E-01
-5.09E-01
3.26E-02
-3.57E-01
-6.61E-01
-5.06E-01
3.61E-02
-3.38E-01
-6.74E-01
-4.96E-01
3.61E-02
-3.28E-01
-6.64E-01
-4.80E-01
3.22E-02
-3.30E-01
-6.30E-01
-4.81E-01
3.50E-02
-3.17E-01
-6.44E-01
-4.77E-01
2.79E-02
-3.47E-01
-6.07E-01
-5.06E-01
3.04E-02
-3.64E-01
-6.48E-01
-2.00E-01
PASS
-5.07E-01
2.19E-02
-4.05E-01
-6.10E-01
-1.30E-01
PASS
-5.03E-01
2.34E-02
-3.94E-01
-6.12E-01
-1.20E-01
PASS
-4.95E-01
2.15E-02
-3.95E-01
-5.95E-01
-1.20E-01
PASS
-4.82E-01
1.81E-02
-3.98E-01
-5.67E-01
-1.10E-01
PASS
-4.82E-01
2.40E-02
-3.70E-01
-5.94E-01
-1.10E-01
PASS
-4.90E-01
2.72E-02
-3.63E-01
-6.17E-01
-1.10E-01
PASS
An ISO 9001:2000 Certified Company
93
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Ps99%/90% (+KTL) Biased
Negative Slew Rate 2 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.44. Plot of Negative Slew Rate 2 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
94
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.44. Raw data for Negative Slew Rate 2 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Slew Rate 2 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-5.37E-01
-5.26E-01
-5.67E-01
-4.81E-01
-5.18E-01
-5.32E-01
-5.82E-01
-5.56E-01
-4.94E-01
-5.12E-01
-5.99E-01
10
-5.52E-01
-5.38E-01
-5.54E-01
-5.00E-01
-5.21E-01
-5.31E-01
-5.83E-01
-5.70E-01
-5.15E-01
-4.98E-01
-6.13E-01
20
-5.22E-01
-5.30E-01
-5.38E-01
-4.95E-01
-5.25E-01
-5.16E-01
-5.93E-01
-5.55E-01
-5.05E-01
-4.88E-01
-5.84E-01
30
-5.13E-01
-5.15E-01
-5.53E-01
-4.75E-01
-5.07E-01
-5.22E-01
-5.83E-01
-5.64E-01
-5.10E-01
-4.91E-01
-5.95E-01
50
-5.02E-01
-4.88E-01
-5.16E-01
-4.79E-01
-4.92E-01
-5.02E-01
-5.60E-01
-5.36E-01
-4.79E-01
-4.70E-01
-5.90E-01
60
-5.02E-01
-5.00E-01
-5.18E-01
-4.68E-01
-4.90E-01
-5.03E-01
-5.85E-01
-5.29E-01
-4.92E-01
-4.74E-01
-6.10E-01
70
-4.95E-01
-5.09E-01
-5.13E-01
-4.65E-01
-4.94E-01
-5.17E-01
-5.86E-01
-5.40E-01
-4.96E-01
-4.85E-01
-6.02E-01
-5.26E-01
3.12E-02
-3.80E-01
-6.71E-01
-5.33E-01
2.27E-02
-4.27E-01
-6.39E-01
-5.22E-01
1.63E-02
-4.46E-01
-5.98E-01
-5.13E-01
2.78E-02
-3.83E-01
-6.42E-01
-4.95E-01
1.42E-02
-4.29E-01
-5.62E-01
-4.96E-01
1.84E-02
-4.10E-01
-5.81E-01
-4.95E-01
1.88E-02
-4.07E-01
-5.83E-01
-5.35E-01
3.49E-02
-3.72E-01
-6.98E-01
-2.00E-01
PASS
-5.39E-01
3.61E-02
-3.71E-01
-7.08E-01
-1.30E-01
PASS
-5.31E-01
4.23E-02
-3.34E-01
-7.29E-01
-1.20E-01
PASS
-5.34E-01
3.83E-02
-3.55E-01
-7.13E-01
-1.20E-01
PASS
-5.09E-01
3.81E-02
-3.32E-01
-6.87E-01
-1.10E-01
PASS
-5.17E-01
4.31E-02
-3.15E-01
-7.18E-01
-1.10E-01
PASS
-5.25E-01
4.02E-02
-3.37E-01
-7.12E-01
-1.10E-01
PASS
An ISO 9001:2000 Certified Company
95
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Ps99%/90% (+KTL) Biased
Negative Slew Rate 3 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.45. Plot of Negative Slew Rate 3 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
96
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.45. Raw data for Negative Slew Rate 3 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Slew Rate 3 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-4.99E-01
-4.91E-01
-5.15E-01
-4.58E-01
-5.03E-01
-4.95E-01
-5.55E-01
-5.22E-01
-4.72E-01
-4.81E-01
-5.48E-01
10
-4.99E-01
-5.01E-01
-5.09E-01
-4.78E-01
-4.85E-01
-4.99E-01
-5.70E-01
-5.50E-01
-4.91E-01
-4.67E-01
-5.73E-01
20
-4.94E-01
-4.92E-01
-5.19E-01
-4.67E-01
-4.92E-01
-4.94E-01
-5.63E-01
-5.22E-01
-4.79E-01
-4.69E-01
-5.69E-01
30
-4.91E-01
-4.94E-01
-5.04E-01
-4.61E-01
-4.79E-01
-4.86E-01
-5.59E-01
-5.36E-01
-4.74E-01
-4.63E-01
-5.96E-01
50
-4.80E-01
-4.58E-01
-4.85E-01
-4.52E-01
-4.58E-01
-4.74E-01
-5.48E-01
-5.17E-01
-4.59E-01
-4.39E-01
-5.54E-01
60
-4.77E-01
-4.74E-01
-4.87E-01
-4.46E-01
-4.66E-01
-4.74E-01
-5.47E-01
-5.11E-01
-4.61E-01
-4.49E-01
-5.67E-01
70
-4.83E-01
-4.71E-01
-4.89E-01
-4.43E-01
-4.61E-01
-4.79E-01
-5.45E-01
-5.21E-01
-4.71E-01
-4.58E-01
-5.89E-01
-4.93E-01
2.15E-02
-3.93E-01
-5.94E-01
-4.94E-01
1.26E-02
-4.36E-01
-5.53E-01
-4.93E-01
1.84E-02
-4.07E-01
-5.79E-01
-4.86E-01
1.65E-02
-4.09E-01
-5.63E-01
-4.67E-01
1.48E-02
-3.97E-01
-5.36E-01
-4.70E-01
1.54E-02
-3.98E-01
-5.42E-01
-4.69E-01
1.83E-02
-3.84E-01
-5.55E-01
-5.05E-01
3.37E-02
-3.48E-01
-6.62E-01
-2.00E-01
PASS
-5.15E-01
4.30E-02
-3.15E-01
-7.16E-01
-1.30E-01
PASS
-5.05E-01
3.79E-02
-3.29E-01
-6.82E-01
-1.20E-01
PASS
-5.04E-01
4.17E-02
-3.09E-01
-6.98E-01
-1.20E-01
PASS
-4.87E-01
4.44E-02
-2.80E-01
-6.94E-01
-1.10E-01
PASS
-4.88E-01
4.02E-02
-3.01E-01
-6.76E-01
-1.10E-01
PASS
-4.95E-01
3.67E-02
-3.24E-01
-6.66E-01
-1.10E-01
PASS
An ISO 9001:2000 Certified Company
97
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Ps99%/90% (+KTL) Biased
Negative Slew Rate 4 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.46. Plot of Negative Slew Rate 4 @ +/-15V (V/us) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
98
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.46. Raw data for Negative Slew Rate 4 @ +/-15V (V/us) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Slew Rate 4 @ +/-15V (V/us)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-5.90E-01
-5.30E-01
-5.04E-01
-5.75E-01
-5.35E-01
-4.88E-01
-5.52E-01
-5.31E-01
-5.59E-01
-5.65E-01
-5.55E-01
10
-5.77E-01
-5.21E-01
-4.95E-01
-5.66E-01
-5.21E-01
-5.11E-01
-5.61E-01
-5.35E-01
-5.41E-01
-5.71E-01
-5.42E-01
20
-5.88E-01
-5.23E-01
-4.99E-01
-5.67E-01
-5.24E-01
-4.94E-01
-5.46E-01
-5.46E-01
-5.45E-01
-5.38E-01
-5.74E-01
30
-5.77E-01
-5.14E-01
-4.97E-01
-5.48E-01
-4.96E-01
-4.84E-01
-5.32E-01
-5.23E-01
-5.54E-01
-5.51E-01
-5.50E-01
50
-5.63E-01
-4.97E-01
-4.76E-01
-5.08E-01
-4.84E-01
-4.76E-01
-5.23E-01
-5.00E-01
-5.35E-01
-5.43E-01
-5.64E-01
60
-5.58E-01
-4.91E-01
-4.76E-01
-5.26E-01
-4.84E-01
-4.73E-01
-5.17E-01
-4.94E-01
-5.37E-01
-5.36E-01
-5.43E-01
70
-5.59E-01
-4.95E-01
-4.91E-01
-5.51E-01
-4.92E-01
-4.80E-01
-5.50E-01
-5.23E-01
-5.42E-01
-5.42E-01
-5.59E-01
-5.47E-01
3.51E-02
-3.83E-01
-7.10E-01
-5.36E-01
3.43E-02
-3.76E-01
-6.96E-01
-5.40E-01
3.63E-02
-3.71E-01
-7.09E-01
-5.26E-01
3.52E-02
-3.62E-01
-6.91E-01
-5.06E-01
3.43E-02
-3.45E-01
-6.66E-01
-5.07E-01
3.43E-02
-3.47E-01
-6.67E-01
-5.18E-01
3.43E-02
-3.58E-01
-6.78E-01
-5.39E-01
3.13E-02
-3.93E-01
-6.85E-01
-2.00E-01
PASS
-5.44E-01
2.34E-02
-4.34E-01
-6.53E-01
-1.30E-01
PASS
-5.34E-01
2.25E-02
-4.29E-01
-6.39E-01
-1.20E-01
PASS
-5.29E-01
2.82E-02
-3.97E-01
-6.60E-01
-1.20E-01
PASS
-5.15E-01
2.74E-02
-3.88E-01
-6.43E-01
-1.10E-01
PASS
-5.11E-01
2.77E-02
-3.82E-01
-6.41E-01
-1.10E-01
PASS
-5.27E-01
2.83E-02
-3.95E-01
-6.59E-01
-1.10E-01
PASS
An ISO 9001:2000 Certified Company
99
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Positive Supply Current @ +5V (A)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.47. Plot of Positive Supply Current @ +5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.47. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Positive Supply Current @ +5V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.37E-03
1.31E-03
1.32E-03
1.32E-03
1.33E-03
1.32E-03
1.38E-03
1.34E-03
1.35E-03
1.33E-03
1.37E-03
10
1.37E-03
1.29E-03
1.31E-03
1.33E-03
1.33E-03
1.38E-03
1.44E-03
1.40E-03
1.41E-03
1.39E-03
1.38E-03
20
1.35E-03
1.30E-03
1.31E-03
1.33E-03
1.33E-03
1.36E-03
1.42E-03
1.38E-03
1.38E-03
1.36E-03
1.38E-03
30
1.32E-03
1.27E-03
1.26E-03
1.30E-03
1.30E-03
1.33E-03
1.39E-03
1.36E-03
1.35E-03
1.33E-03
1.37E-03
50
1.24E-03
1.18E-03
1.17E-03
1.21E-03
1.21E-03
1.27E-03
1.33E-03
1.29E-03
1.29E-03
1.27E-03
1.37E-03
60
1.24E-03
1.19E-03
1.18E-03
1.21E-03
1.22E-03
1.27E-03
1.34E-03
1.29E-03
1.29E-03
1.28E-03
1.37E-03
70
1.22E-03
1.16E-03
1.15E-03
1.18E-03
1.18E-03
1.27E-03
1.32E-03
1.28E-03
1.29E-03
1.27E-03
1.37E-03
1.33E-03
2.44E-05
1.45E-03
1.22E-03
1.32E-03
2.85E-05
1.46E-03
1.19E-03
1.32E-03
1.79E-05
1.41E-03
1.24E-03
1.29E-03
2.54E-05
1.41E-03
1.17E-03
1.20E-03
2.51E-05
1.32E-03
1.08E-03
1.21E-03
2.36E-05
1.32E-03
1.10E-03
1.18E-03
2.77E-05
1.31E-03
1.05E-03
1.34E-03
2.14E-05
1.44E-03
1.24E-03
2.00E-03
PASS
1.40E-03
2.43E-05
1.52E-03
1.29E-03
2.00E-03
PASS
1.38E-03
2.31E-05
1.49E-03
1.27E-03
2.00E-03
PASS
1.35E-03
2.45E-05
1.47E-03
1.24E-03
2.00E-03
PASS
1.29E-03
2.53E-05
1.41E-03
1.17E-03
2.00E-03
PASS
1.29E-03
2.56E-05
1.41E-03
1.17E-03
2.00E-03
PASS
1.29E-03
2.12E-05
1.38E-03
1.19E-03
2.00E-03
PASS
An ISO 9001:2000 Certified Company
101
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Negative Supply Current @ +5V (A)
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.48. Plot of Negative Supply Current @ +5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.48. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Negative Supply Current @ +5V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-1.35E-03
-1.29E-03
-1.30E-03
-1.31E-03
-1.32E-03
-1.30E-03
-1.36E-03
-1.32E-03
-1.33E-03
-1.32E-03
-1.35E-03
10
-1.35E-03
-1.28E-03
-1.28E-03
-1.31E-03
-1.30E-03
-1.36E-03
-1.42E-03
-1.38E-03
-1.38E-03
-1.37E-03
-1.36E-03
20
-1.33E-03
-1.27E-03
-1.29E-03
-1.31E-03
-1.31E-03
-1.34E-03
-1.40E-03
-1.36E-03
-1.36E-03
-1.34E-03
-1.36E-03
30
-1.30E-03
-1.25E-03
-1.23E-03
-1.27E-03
-1.27E-03
-1.31E-03
-1.37E-03
-1.33E-03
-1.34E-03
-1.32E-03
-1.35E-03
50
-1.21E-03
-1.16E-03
-1.15E-03
-1.19E-03
-1.19E-03
-1.25E-03
-1.30E-03
-1.27E-03
-1.27E-03
-1.25E-03
-1.34E-03
60
-1.21E-03
-1.16E-03
-1.16E-03
-1.19E-03
-1.20E-03
-1.25E-03
-1.31E-03
-1.27E-03
-1.28E-03
-1.25E-03
-1.35E-03
70
-1.20E-03
-1.14E-03
-1.13E-03
-1.16E-03
-1.16E-03
-1.24E-03
-1.30E-03
-1.26E-03
-1.27E-03
-1.25E-03
-1.35E-03
-1.31E-03
2.41E-05
-1.20E-03
-1.43E-03
-1.30E-03
2.87E-05
-1.17E-03
-1.44E-03
-1.30E-03
2.13E-05
-1.20E-03
-1.40E-03
-1.26E-03
2.52E-05
-1.15E-03
-1.38E-03
-1.18E-03
2.52E-05
-1.06E-03
-1.30E-03
-1.18E-03
2.36E-05
-1.07E-03
-1.29E-03
-1.16E-03
2.81E-05
-1.03E-03
-1.29E-03
-1.33E-03
2.17E-05
-1.23E-03
-1.43E-03
-2.00E-03
PASS
-1.38E-03
2.38E-05
-1.27E-03
-1.49E-03
-2.00E-03
PASS
-1.36E-03
2.44E-05
-1.24E-03
-1.47E-03
-2.00E-03
PASS
-1.33E-03
2.48E-05
-1.22E-03
-1.45E-03
-2.00E-03
PASS
-1.27E-03
2.29E-05
-1.16E-03
-1.37E-03
-2.00E-03
PASS
-1.27E-03
2.30E-05
-1.16E-03
-1.38E-03
-2.00E-03
PASS
-1.26E-03
2.49E-05
-1.15E-03
-1.38E-03
-2.00E-03
PASS
An ISO 9001:2000 Certified Company
103
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
8.00E-04
Offset Voltage 1 @ +5V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.49. Plot of Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
104
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.49. Raw data for Offset Voltage 1 @ +5V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 1 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-4.28E-05
-2.98E-05
5.64E-05
-9.20E-05
-1.40E-05
-4.43E-05
3.10E-05
-5.80E-05
-7.83E-05
-7.61E-05
-4.25E-05
10
-4.93E-05
-2.59E-05
6.15E-05
-9.77E-05
-1.79E-05
-3.88E-05
4.02E-05
-5.06E-05
-6.93E-05
-6.45E-05
-4.44E-05
20
-4.32E-05
-1.18E-05
7.25E-05
-8.63E-05
-4.84E-06
-2.58E-05
4.31E-05
-4.13E-05
-5.88E-05
-5.58E-05
-4.66E-05
30
-3.22E-05
-4.23E-06
8.92E-05
-7.59E-05
8.57E-06
-1.49E-05
5.01E-05
-3.39E-05
-4.91E-05
-4.46E-05
-4.44E-05
50
-1.23E-05
1.15E-05
1.02E-04
-4.54E-05
4.18E-05
7.19E-07
6.16E-05
-1.82E-05
-3.34E-05
-3.15E-05
-4.30E-05
60
-1.28E-05
9.53E-06
1.04E-04
-4.50E-05
4.16E-05
7.19E-07
6.07E-05
-1.90E-05
-3.20E-05
-2.98E-05
-4.32E-05
70
-2.39E-05
-1.82E-06
1.01E-04
-7.18E-05
2.63E-05
-1.44E-05
5.93E-05
-3.51E-05
-5.36E-05
-5.20E-05
-4.50E-05
-2.44E-05
5.38E-05
2.27E-04
-2.75E-04
-2.58E-05
5.79E-05
2.44E-04
-2.96E-04
-1.47E-05
5.84E-05
2.58E-04
-2.87E-04
-2.92E-06
6.09E-05
2.81E-04
-2.87E-04
1.95E-05
5.61E-05
2.81E-04
-2.42E-04
1.95E-05
5.69E-05
2.85E-04
-2.46E-04
5.93E-06
6.41E-05
3.05E-04
-2.93E-04
-4.51E-05
4.48E-05
1.64E-04
-2.54E-04
-4.50E-04
PASS
4.50E-04
PASS
-3.66E-05
4.46E-05
1.71E-04
-2.45E-04
-6.00E-04
PASS
6.00E-04
PASS
-2.77E-05
4.17E-05
1.67E-04
-2.22E-04
-6.00E-04
PASS
6.00E-04
PASS
-1.85E-05
4.05E-05
1.71E-04
-2.08E-04
-6.00E-04
PASS
6.00E-04
PASS
-4.18E-06
3.92E-05
1.79E-04
-1.87E-04
-7.50E-04
PASS
7.50E-04
PASS
-3.87E-06
3.84E-05
1.75E-04
-1.83E-04
-7.50E-04
PASS
7.50E-04
PASS
-1.92E-05
4.66E-05
1.98E-04
-2.37E-04
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2000 Certified Company
105
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
Offset Voltage 2 @ +5V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.50. Plot of Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
106
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.50. Raw data for Offset Voltage 2 @ +5V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 2 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-5.53E-05
4.47E-05
5.46E-05
-8.86E-05
2.48E-05
-4.85E-05
3.14E-05
-4.46E-05
-5.56E-06
-4.43E-05
2.38E-07
10
-5.13E-05
5.77E-05
6.39E-05
-8.10E-05
2.84E-05
-4.66E-05
3.65E-05
-3.64E-05
8.57E-06
-2.85E-05
-4.88E-07
20
-3.89E-05
7.20E-05
7.57E-05
-7.10E-05
4.27E-05
-3.72E-05
5.08E-05
-3.39E-05
2.01E-05
-1.59E-05
-1.58E-06
30
-2.73E-05
8.28E-05
8.87E-05
-5.63E-05
5.48E-05
-2.74E-05
6.40E-05
-3.47E-05
2.56E-05
-6.64E-06
-1.33E-06
50
-3.51E-06
1.03E-04
1.08E-04
-3.65E-05
7.49E-05
-1.28E-05
8.92E-05
-3.17E-05
4.37E-05
1.52E-05
-1.45E-06
60
-3.99E-06
1.03E-04
1.07E-04
-3.63E-05
7.39E-05
-1.21E-05
8.84E-05
-3.02E-05
4.41E-05
1.54E-05
-6.09E-07
70
-1.74E-05
6.59E-05
9.10E-05
-5.72E-05
5.59E-05
-4.03E-05
8.60E-05
-4.02E-05
1.27E-05
-1.63E-05
7.16E-07
-3.99E-06
6.41E-05
2.95E-04
-3.03E-04
3.52E-06
6.59E-05
3.11E-04
-3.04E-04
1.61E-05
6.71E-05
3.29E-04
-2.97E-04
2.86E-05
6.63E-05
3.38E-04
-2.81E-04
4.92E-05
6.55E-05
3.55E-04
-2.56E-04
4.86E-05
6.51E-05
3.52E-04
-2.55E-04
2.76E-05
6.23E-05
3.18E-04
-2.63E-04
-2.23E-05
3.48E-05
1.40E-04
-1.85E-04
-4.50E-04
PASS
4.50E-04
PASS
-1.33E-05
3.47E-05
1.49E-04
-1.75E-04
-6.00E-04
PASS
6.00E-04
PASS
-3.22E-06
3.78E-05
1.73E-04
-1.80E-04
-6.00E-04
PASS
6.00E-04
PASS
4.18E-06
4.08E-05
1.95E-04
-1.86E-04
-6.00E-04
PASS
6.00E-04
PASS
2.07E-05
4.78E-05
2.44E-04
-2.02E-04
-7.50E-04
PASS
7.50E-04
PASS
2.11E-05
4.69E-05
2.40E-04
-1.98E-04
-7.50E-04
PASS
7.50E-04
PASS
3.78E-07
5.26E-05
2.46E-04
-2.45E-04
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2000 Certified Company
107
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
8.00E-04
Offset Voltage 3 @ +5V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.51. Plot of Offset Voltage 3 @ +5V (V) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.51. Raw data for Offset Voltage 3 @ +5V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 3 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-8.21E-05
-1.18E-04
1.39E-05
-1.28E-04
-1.92E-05
-5.69E-05
-8.98E-05
-1.72E-05
-7.54E-05
-3.51E-06
-8.18E-05
10
-7.62E-05
-1.12E-04
1.75E-05
-1.28E-04
-1.51E-05
-5.53E-05
-8.19E-05
-6.29E-06
-6.47E-05
1.09E-05
-8.20E-05
20
-6.83E-05
-9.56E-05
2.50E-05
-1.16E-04
-3.99E-06
-4.96E-05
-8.24E-05
3.85E-06
-5.43E-05
1.81E-05
-8.37E-05
30
-6.01E-05
-8.31E-05
2.35E-05
-1.07E-04
6.28E-06
-4.43E-05
-7.70E-05
5.91E-06
-4.61E-05
2.79E-05
-8.04E-05
50
-4.22E-05
-6.43E-05
5.49E-05
-8.06E-05
2.97E-05
-3.17E-05
-6.96E-05
1.87E-05
-2.91E-05
4.71E-05
-7.97E-05
60
-4.30E-05
-6.83E-05
5.27E-05
-7.97E-05
2.96E-05
-3.02E-05
-6.99E-05
1.62E-05
-2.56E-05
4.96E-05
-8.11E-05
70
-5.54E-05
-7.91E-05
4.67E-05
-9.28E-05
2.81E-05
-4.39E-05
-7.44E-05
9.17E-06
-3.51E-05
2.14E-05
-7.98E-05
-6.67E-05
6.20E-05
2.23E-04
-3.56E-04
-6.27E-05
6.24E-05
2.28E-04
-3.54E-04
-5.17E-05
6.01E-05
2.29E-04
-3.32E-04
-4.40E-05
5.66E-05
2.20E-04
-3.08E-04
-2.05E-05
5.96E-05
2.58E-04
-2.99E-04
-2.17E-05
5.95E-05
2.56E-04
-2.99E-04
-3.05E-05
6.38E-05
2.67E-04
-3.28E-04
-4.85E-05
3.71E-05
1.25E-04
-2.22E-04
-4.50E-04
PASS
4.50E-04
PASS
-3.95E-05
3.98E-05
1.46E-04
-2.25E-04
-6.00E-04
PASS
6.00E-04
PASS
-3.29E-05
4.23E-05
1.64E-04
-2.30E-04
-6.00E-04
PASS
6.00E-04
PASS
-2.67E-05
4.26E-05
1.72E-04
-2.26E-04
-6.00E-04
PASS
6.00E-04
PASS
-1.29E-05
4.59E-05
2.01E-04
-2.27E-04
-7.50E-04
PASS
7.50E-04
PASS
-1.20E-05
4.60E-05
2.03E-04
-2.27E-04
-7.50E-04
PASS
7.50E-04
PASS
-2.46E-05
3.94E-05
1.59E-04
-2.08E-04
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2000 Certified Company
109
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
Offset Voltage 4 @ +5V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.52. Plot of Offset Voltage 4 @ +5V (V) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.52. Raw data for Offset Voltage 4 @ +5V (V) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Voltage 4 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-3.67E-05
7.56E-05
-6.36E-05
7.85E-06
5.53E-05
-1.61E-05
3.14E-05
4.38E-05
5.31E-06
-6.69E-05
-5.36E-05
10
-3.49E-05
9.15E-05
-5.28E-05
1.39E-05
4.85E-05
-3.63E-06
3.83E-05
5.58E-05
4.87E-05
-2.54E-05
-5.81E-05
20
-2.28E-05
1.07E-04
-4.23E-05
2.56E-05
6.81E-05
5.91E-06
4.66E-05
6.22E-05
6.38E-05
-9.42E-06
-5.58E-05
30
-1.58E-05
1.16E-04
-3.94E-05
3.71E-05
8.03E-05
1.58E-05
5.23E-05
6.95E-05
7.38E-05
3.60E-07
-5.67E-05
50
-8.33E-06
1.42E-04
-1.49E-05
5.60E-05
1.00E-04
3.62E-05
6.54E-05
8.75E-05
9.41E-05
1.85E-05
-5.50E-05
60
-8.70E-06
1.42E-04
-1.71E-05
5.53E-05
1.01E-04
3.57E-05
6.52E-05
9.02E-05
9.19E-05
1.58E-05
-5.41E-05
70
-2.76E-05
1.35E-04
-3.24E-05
5.25E-05
7.98E-05
-2.50E-07
4.90E-05
5.66E-05
6.93E-05
2.77E-06
-5.65E-05
7.68E-06
5.90E-05
2.83E-04
-2.68E-04
1.33E-05
5.93E-05
2.90E-04
-2.63E-04
2.71E-05
6.20E-05
3.17E-04
-2.62E-04
3.55E-05
6.45E-05
3.37E-04
-2.66E-04
5.49E-05
6.79E-05
3.72E-04
-2.62E-04
5.45E-05
6.88E-05
3.76E-04
-2.67E-04
4.14E-05
7.17E-05
3.76E-04
-2.93E-04
-4.87E-07
4.38E-05
2.04E-04
-2.05E-04
-4.50E-04
PASS
4.50E-04
PASS
2.27E-05
3.54E-05
1.88E-04
-1.42E-04
-6.00E-04
PASS
6.00E-04
PASS
3.38E-05
3.36E-05
1.91E-04
-1.23E-04
-6.00E-04
PASS
6.00E-04
PASS
4.23E-05
3.28E-05
1.95E-04
-1.10E-04
-6.00E-04
PASS
6.00E-04
PASS
6.03E-05
3.26E-05
2.12E-04
-9.16E-05
-7.50E-04
PASS
7.50E-04
PASS
5.97E-05
3.35E-05
2.16E-04
-9.66E-05
-7.50E-04
PASS
7.50E-04
PASS
3.55E-05
3.21E-05
1.85E-04
-1.14E-04
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2000 Certified Company
111
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 1 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.53. Plot of Offset Current 1 @ +5V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.53. Raw data for Offset Current 1 @ +5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 1 @ +5V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.14E-10
1.80E-11
-3.60E-11
-1.42E-10
0.00E+00
-8.30E-11
-1.64E-10
1.38E-10
-1.52E-10
-5.10E-11
-1.80E-11
10
1.49E-10
7.40E-11
-4.40E-11
-1.16E-10
-2.60E-11
-4.70E-11
-1.42E-10
1.67E-10
-1.33E-10
-1.30E-11
-1.50E-11
20
1.81E-10
-3.40E-11
1.60E-10
-1.37E-10
7.40E-11
-1.40E-11
-1.90E-11
1.23E-10
-1.00E-10
-5.00E-11
-2.10E-11
30
1.46E-10
0.00E+00
1.13E-09
-5.70E-11
3.10E-11
-1.70E-11
1.50E-11
1.84E-10
-1.23E-10
3.10E-11
-1.70E-11
50
1.72E-10
-2.30E-11
1.14E-09
4.00E-12
4.30E-11
5.90E-11
1.64E-10
2.46E-10
1.60E-11
1.33E-10
-3.30E-11
60
2.01E-10
-3.00E-11
1.12E-09
-2.00E-12
5.40E-11
1.00E-10
1.92E-10
3.16E-10
6.10E-11
1.34E-10
-2.80E-11
70
-3.60E-11
4.70E-11
7.73E-10
-2.60E-11
-6.00E-12
9.60E-11
-5.80E-11
1.58E-10
4.50E-11
1.54E-10
-4.00E-11
-9.20E-12
9.27E-11
4.23E-10
-4.42E-10
7.40E-12
1.04E-10
4.94E-10
-4.79E-10
4.88E-11
1.34E-10
6.74E-10
-5.77E-10
2.50E-10
4.98E-10
2.58E-09
-2.07E-09
2.67E-10
4.94E-10
2.57E-09
-2.04E-09
2.69E-10
4.85E-10
2.53E-09
-1.99E-09
1.50E-10
3.50E-10
1.78E-09
-1.48E-09
-6.24E-11
1.22E-10
5.05E-10
-6.29E-10
-1.00E-08
PASS
1.00E-08
PASS
-3.36E-11
1.25E-10
5.50E-10
-6.17E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.20E-11
8.29E-11
3.75E-10
-3.99E-10
-1.00E-08
PASS
1.00E-08
PASS
1.80E-11
1.10E-10
5.34E-10
-4.98E-10
-1.00E-08
PASS
1.00E-08
PASS
1.24E-10
9.01E-11
5.44E-10
-2.97E-10
-1.50E-08
PASS
1.50E-08
PASS
1.61E-10
9.93E-11
6.24E-10
-3.03E-10
-1.50E-08
PASS
1.50E-08
PASS
7.90E-11
8.96E-11
4.97E-10
-3.39E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
113
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 2 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.54. Plot of Offset Current 2 @ +5V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.54. Raw data for Offset Current 2 @ +5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 2 @ +5V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-3.30E-11
-8.80E-11
2.20E-11
1.00E-11
1.02E-10
7.90E-11
-1.48E-10
9.30E-11
-4.20E-11
-2.20E-11
2.00E-11
10
-5.30E-11
-1.07E-10
9.10E-11
1.06E-10
6.40E-11
1.52E-10
-2.17E-10
8.20E-11
4.90E-11
1.40E-11
6.00E-12
20
3.50E-11
-6.20E-11
1.90E-11
1.87E-10
1.86E-10
1.89E-10
-2.86E-10
1.32E-10
1.47E-10
5.60E-11
-4.00E-12
30
3.70E-11
-3.00E-12
3.60E-11
1.75E-10
2.79E-10
1.63E-10
-2.89E-10
1.88E-10
3.10E-11
-5.90E-11
5.00E-12
50
9.00E-12
4.60E-11
4.00E-12
3.66E-10
3.85E-10
1.64E-10
-3.05E-10
3.01E-10
8.10E-11
9.60E-11
-1.10E-11
60
7.00E-11
5.60E-11
9.00E-12
2.96E-10
3.64E-10
1.89E-10
-2.63E-10
3.41E-10
9.30E-11
8.80E-11
7.00E-12
70
-7.00E-12
-1.06E-10
-3.50E-11
2.52E-10
2.00E-10
1.49E-10
-3.88E-10
2.70E-10
1.42E-10
6.00E-12
1.10E-11
2.60E-12
7.03E-11
3.31E-10
-3.26E-10
2.02E-11
9.46E-11
4.62E-10
-4.21E-10
7.30E-11
1.10E-10
5.86E-10
-4.40E-10
1.05E-10
1.19E-10
6.58E-10
-4.48E-10
1.62E-10
1.96E-10
1.08E-09
-7.51E-10
1.59E-10
1.60E-10
9.03E-10
-5.85E-10
6.08E-11
1.56E-10
7.89E-10
-6.68E-10
-8.00E-12
9.84E-11
4.51E-10
-4.67E-10
-1.00E-08
PASS
1.00E-08
PASS
1.60E-11
1.40E-10
6.69E-10
-6.37E-10
-1.00E-08
PASS
1.00E-08
PASS
4.76E-11
1.93E-10
9.46E-10
-8.51E-10
-1.00E-08
PASS
1.00E-08
PASS
6.80E-12
1.93E-10
9.09E-10
-8.96E-10
-1.00E-08
PASS
1.00E-08
PASS
6.74E-11
2.26E-10
1.12E-09
-9.85E-10
-1.50E-08
PASS
1.50E-08
PASS
8.96E-11
2.22E-10
1.13E-09
-9.47E-10
-1.50E-08
PASS
1.50E-08
PASS
3.58E-11
2.55E-10
1.22E-09
-1.15E-09
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
115
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 3 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.55. Plot of Offset Current 3 @ +5V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.55. Raw data for Offset Current 3 @ +5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 3 @ +5V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-1.50E-11
1.00E-12
-3.80E-11
-5.80E-11
-3.30E-11
5.00E-11
-4.00E-12
1.10E-11
9.00E-12
-3.50E-11
3.00E-12
10
-5.00E-11
7.00E-12
-4.40E-11
-3.10E-11
-4.30E-11
1.10E-11
-2.90E-11
-3.00E-11
-3.00E-12
-9.80E-11
0.00E+00
20
-2.30E-11
3.70E-11
-5.70E-11
4.10E-11
5.10E-11
6.40E-11
5.90E-11
-1.40E-11
6.60E-11
-5.90E-11
3.00E-12
30
-5.60E-11
9.00E-11
2.32E-09
1.07E-10
7.10E-11
3.90E-11
5.00E-12
-1.60E-11
7.20E-11
3.10E-11
1.10E-11
50
3.30E-11
1.55E-10
1.59E-09
1.70E-10
2.50E-10
7.40E-11
-1.00E-11
7.40E-11
9.60E-11
1.57E-10
1.40E-11
60
2.20E-11
1.14E-10
1.60E-09
1.38E-10
2.52E-10
1.41E-10
-2.80E-11
1.31E-10
1.79E-10
1.44E-10
-2.00E-11
70
-2.00E-12
-8.00E-12
7.36E-10
1.22E-10
4.00E-12
1.90E-10
1.15E-10
5.20E-11
1.48E-10
9.30E-11
0.00E+00
-2.86E-11
2.25E-11
7.66E-11
-1.34E-10
-3.22E-11
2.30E-11
7.50E-11
-1.39E-10
9.80E-12
4.73E-11
2.30E-10
-2.11E-10
5.06E-10
1.01E-09
5.24E-09
-4.23E-09
4.40E-10
6.49E-10
3.47E-09
-2.59E-09
4.25E-10
6.62E-10
3.52E-09
-2.66E-09
1.70E-10
3.21E-10
1.67E-09
-1.33E-09
6.20E-12
3.06E-11
1.49E-10
-1.37E-10
-1.00E-08
PASS
1.00E-08
PASS
-2.98E-11
4.19E-11
1.66E-10
-2.25E-10
-1.00E-08
PASS
1.00E-08
PASS
2.32E-11
5.68E-11
2.88E-10
-2.42E-10
-1.00E-08
PASS
1.00E-08
PASS
2.62E-11
3.36E-11
1.83E-10
-1.31E-10
-1.00E-08
PASS
1.00E-08
PASS
7.82E-11
5.99E-11
3.58E-10
-2.01E-10
-1.50E-08
PASS
1.50E-08
PASS
1.13E-10
8.11E-11
4.92E-10
-2.65E-10
-1.50E-08
PASS
1.50E-08
PASS
1.20E-10
5.26E-11
3.65E-10
-1.26E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
117
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 4 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.56. Plot of Offset Current 4 @ +5V (A) versus total dose. The data show no significant degradation
with radiation. The solid diamonds are the average of measured data points from the biased sample (devices
irradiated with an electrical bias) while the shaded diamonds are the average from the unbiased sample. The
black lines show the effects on the data after application of the biased KTL statistics (solid and dashed lines)
while the gray lines show the effects on the data after application of the unbiased KTL statistics (solid and
dashed lines). The red dashed lines are the minimum and maximum specification values as defined in the
datasheet and/or test plan.
An ISO 9001:2000 Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.56. Raw data for Offset Current 4 @ +5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Offset Current 4 @ +5V (A)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
6.40E-11
-5.50E-11
-3.80E-11
-3.70E-11
-1.44E-10
8.00E-12
-1.00E-11
4.50E-11
-2.56E-10
-6.10E-11
-8.00E-11
10
1.35E-10
-7.40E-11
7.00E-12
8.00E-11
-3.60E-11
-3.20E-11
5.60E-11
1.00E-11
-2.84E-10
-1.64E-10
-7.50E-11
20
2.11E-10
-2.10E-11
3.90E-11
1.37E-10
1.30E-11
-1.56E-10
-9.80E-11
-1.10E-11
-3.47E-10
-1.76E-10
-6.80E-11
30
1.58E-10
1.88E-10
2.83E-09
2.10E-10
-1.05E-10
-1.79E-10
-1.26E-10
-1.70E-11
-3.37E-10
-2.33E-10
-7.10E-11
50
2.53E-10
2.55E-10
2.09E-09
2.48E-10
-2.20E-11
-2.10E-10
-1.82E-10
-5.10E-11
-3.50E-10
-1.83E-10
-6.00E-11
60
1.92E-10
1.80E-10
2.14E-09
2.60E-10
-5.30E-11
-1.77E-10
-9.00E-11
-1.35E-10
-3.90E-10
-1.98E-10
-7.70E-11
70
1.14E-10
2.70E-10
1.01E-09
2.66E-10
-1.80E-10
5.10E-11
1.39E-10
1.39E-10
-1.52E-10
-6.00E-11
-6.80E-11
-4.20E-11
7.39E-11
3.03E-10
-3.87E-10
2.24E-11
8.51E-11
4.19E-10
-3.74E-10
7.58E-11
9.58E-11
5.23E-10
-3.71E-10
6.56E-10
1.22E-09
6.35E-09
-5.04E-09
5.64E-10
8.59E-10
4.57E-09
-3.44E-09
5.43E-10
8.98E-10
4.73E-09
-3.65E-09
2.96E-10
4.39E-10
2.34E-09
-1.75E-09
-5.48E-11
1.19E-10
4.99E-10
-6.09E-10
-1.00E-08
PASS
1.00E-08
PASS
-8.28E-11
1.39E-10
5.67E-10
-7.32E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.58E-10
1.24E-10
4.20E-10
-7.35E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.78E-10
1.19E-10
3.78E-10
-7.35E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.95E-10
1.06E-10
3.01E-10
-6.92E-10
-1.50E-08
PASS
1.50E-08
PASS
-1.98E-10
1.15E-10
3.39E-10
-7.35E-10
-1.50E-08
PASS
1.50E-08
PASS
2.34E-11
1.28E-10
6.19E-10
-5.72E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2000 Certified Company
119
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 1 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.57. Plot of Positive Bias Current 1 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.57. Raw data for Positive Bias Current 1 @ +/-5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 1 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.32E-08
1.21E-08
1.28E-08
1.29E-08
1.30E-08
1.28E-08
1.23E-08
1.21E-08
1.36E-08
1.28E-08
1.19E-08
10
1.61E-08
1.44E-08
1.52E-08
1.55E-08
1.56E-08
1.50E-08
1.46E-08
1.43E-08
1.59E-08
1.50E-08
1.20E-08
20
1.98E-08
1.80E-08
1.87E-08
1.91E-08
1.92E-08
1.75E-08
1.68E-08
1.67E-08
1.83E-08
1.75E-08
1.20E-08
30
2.32E-08
2.11E-08
1.99E-08
2.24E-08
2.25E-08
1.95E-08
1.88E-08
1.86E-08
2.04E-08
1.95E-08
1.19E-08
50
3.05E-08
2.78E-08
2.68E-08
2.92E-08
2.93E-08
2.37E-08
2.30E-08
2.28E-08
2.48E-08
2.38E-08
1.19E-08
60
3.05E-08
2.79E-08
2.69E-08
2.93E-08
2.94E-08
2.35E-08
2.28E-08
2.27E-08
2.46E-08
2.36E-08
1.19E-08
70
2.78E-08
2.56E-08
2.61E-08
2.70E-08
2.74E-08
2.14E-08
2.07E-08
2.07E-08
2.25E-08
2.15E-08
1.19E-08
1.28E-08
4.34E-10
1.48E-08
1.08E-08
1.54E-08
6.03E-10
1.82E-08
1.25E-08
1.90E-08
6.41E-10
2.19E-08
1.60E-08
2.18E-08
1.30E-09
2.79E-08
1.58E-08
2.87E-08
1.44E-09
3.54E-08
2.20E-08
2.88E-08
1.44E-09
3.55E-08
2.21E-08
2.68E-08
8.91E-10
3.09E-08
2.26E-08
1.27E-08
5.67E-10
1.54E-08
1.01E-08
-5.00E-08
PASS
5.00E-08
PASS
1.50E-08
6.09E-10
1.78E-08
1.21E-08
-8.00E-08
PASS
8.00E-08
PASS
1.74E-08
6.57E-10
2.04E-08
1.43E-08
-1.00E-07
PASS
1.00E-07
PASS
1.94E-08
7.05E-10
2.27E-08
1.61E-08
-1.00E-07
PASS
1.00E-07
PASS
2.36E-08
7.80E-10
2.72E-08
2.00E-08
-1.25E-07
PASS
1.25E-07
PASS
2.34E-08
7.78E-10
2.71E-08
1.98E-08
-1.25E-07
PASS
1.25E-07
PASS
2.14E-08
7.24E-10
2.48E-08
1.80E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
121
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 2 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.58. Plot of Positive Bias Current 2 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.58. Raw data for Positive Bias Current 2 @ +/-5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 2 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.26E-08
1.37E-08
1.32E-08
1.31E-08
1.36E-08
1.35E-08
1.33E-08
1.24E-08
1.34E-08
1.38E-08
1.20E-08
10
1.53E-08
1.63E-08
1.58E-08
1.58E-08
1.64E-08
1.58E-08
1.57E-08
1.47E-08
1.56E-08
1.62E-08
1.21E-08
20
1.89E-08
2.01E-08
1.93E-08
1.94E-08
2.03E-08
1.82E-08
1.83E-08
1.70E-08
1.81E-08
1.88E-08
1.21E-08
30
2.21E-08
2.34E-08
2.21E-08
2.28E-08
2.36E-08
2.02E-08
2.03E-08
1.90E-08
2.03E-08
2.11E-08
1.20E-08
50
2.90E-08
3.05E-08
2.90E-08
2.98E-08
3.07E-08
2.47E-08
2.48E-08
2.32E-08
2.47E-08
2.58E-08
1.20E-08
60
2.91E-08
3.06E-08
2.91E-08
3.00E-08
3.09E-08
2.45E-08
2.46E-08
2.30E-08
2.46E-08
2.56E-08
1.20E-08
70
2.63E-08
2.86E-08
2.74E-08
2.75E-08
2.86E-08
2.23E-08
2.24E-08
2.07E-08
2.23E-08
2.33E-08
1.20E-08
1.32E-08
4.40E-10
1.53E-08
1.12E-08
1.59E-08
4.55E-10
1.80E-08
1.38E-08
1.96E-08
5.65E-10
2.22E-08
1.69E-08
2.28E-08
7.15E-10
2.61E-08
1.95E-08
2.98E-08
8.15E-10
3.36E-08
2.60E-08
2.99E-08
8.06E-10
3.37E-08
2.62E-08
2.77E-08
9.48E-10
3.21E-08
2.33E-08
1.33E-08
5.29E-10
1.58E-08
1.08E-08
-5.00E-08
PASS
5.00E-08
PASS
1.56E-08
5.69E-10
1.83E-08
1.30E-08
-8.00E-08
PASS
8.00E-08
PASS
1.81E-08
6.53E-10
2.11E-08
1.50E-08
-1.00E-07
PASS
1.00E-07
PASS
2.02E-08
7.57E-10
2.37E-08
1.67E-08
-1.00E-07
PASS
1.00E-07
PASS
2.46E-08
9.32E-10
2.90E-08
2.03E-08
-1.25E-07
PASS
1.25E-07
PASS
2.45E-08
9.14E-10
2.87E-08
2.02E-08
-1.25E-07
PASS
1.25E-07
PASS
2.22E-08
9.42E-10
2.66E-08
1.78E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
123
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 3 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.59. Plot of Positive Bias Current 3 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.59. Raw data for Positive Bias Current 3 @ +/-5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 3 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.21E-08
1.31E-08
1.26E-08
1.34E-08
1.32E-08
1.31E-08
1.25E-08
1.20E-08
1.30E-08
1.26E-08
1.16E-08
10
1.47E-08
1.55E-08
1.51E-08
1.60E-08
1.59E-08
1.52E-08
1.46E-08
1.41E-08
1.53E-08
1.50E-08
1.16E-08
20
1.83E-08
1.92E-08
1.85E-08
1.98E-08
1.97E-08
1.75E-08
1.70E-08
1.64E-08
1.76E-08
1.73E-08
1.16E-08
30
2.14E-08
2.24E-08
2.05E-08
2.31E-08
2.32E-08
1.95E-08
1.90E-08
1.84E-08
1.97E-08
1.94E-08
1.16E-08
50
2.80E-08
2.92E-08
2.72E-08
3.01E-08
3.02E-08
2.38E-08
2.33E-08
2.24E-08
2.40E-08
2.37E-08
1.15E-08
60
2.81E-08
2.93E-08
2.74E-08
3.02E-08
3.03E-08
2.35E-08
2.31E-08
2.22E-08
2.38E-08
2.35E-08
1.15E-08
70
2.54E-08
2.73E-08
2.59E-08
2.77E-08
2.80E-08
2.14E-08
2.09E-08
2.01E-08
2.15E-08
2.14E-08
1.15E-08
1.29E-08
5.13E-10
1.53E-08
1.05E-08
1.55E-08
5.65E-10
1.81E-08
1.28E-08
1.91E-08
6.80E-10
2.23E-08
1.59E-08
2.21E-08
1.15E-09
2.75E-08
1.68E-08
2.89E-08
1.28E-09
3.49E-08
2.29E-08
2.90E-08
1.30E-09
3.51E-08
2.30E-08
2.69E-08
1.13E-09
3.22E-08
2.16E-08
1.26E-08
4.58E-10
1.48E-08
1.05E-08
-5.00E-08
PASS
5.00E-08
PASS
1.48E-08
5.01E-10
1.72E-08
1.25E-08
-8.00E-08
PASS
8.00E-08
PASS
1.72E-08
4.78E-10
1.94E-08
1.49E-08
-1.00E-07
PASS
1.00E-07
PASS
1.92E-08
5.26E-10
2.17E-08
1.68E-08
-1.00E-07
PASS
1.00E-07
PASS
2.34E-08
6.08E-10
2.63E-08
2.06E-08
-1.25E-07
PASS
1.25E-07
PASS
2.32E-08
6.15E-10
2.61E-08
2.04E-08
-1.25E-07
PASS
1.25E-07
PASS
2.11E-08
5.65E-10
2.37E-08
1.84E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
125
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 4 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.60. Plot of Positive Bias Current 4 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.60. Raw data for Positive Bias Current 4 @ +/-5V (A) versus total dose, including the
statistical analysis, the specification and the status of the testing (pass/fail).
Positive Bias Current 4 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.36E-08
1.31E-08
1.33E-08
1.32E-08
1.42E-08
1.32E-08
1.27E-08
1.33E-08
1.43E-08
1.32E-08
1.23E-08
10
1.66E-08
1.57E-08
1.57E-08
1.59E-08
1.68E-08
1.55E-08
1.50E-08
1.57E-08
1.66E-08
1.55E-08
1.24E-08
20
2.04E-08
1.94E-08
1.93E-08
1.96E-08
2.07E-08
1.80E-08
1.76E-08
1.82E-08
1.92E-08
1.80E-08
1.24E-08
30
2.40E-08
2.26E-08
2.17E-08
2.29E-08
2.42E-08
2.02E-08
1.97E-08
2.02E-08
2.14E-08
2.02E-08
1.24E-08
50
3.15E-08
2.95E-08
2.86E-08
3.00E-08
3.15E-08
2.47E-08
2.42E-08
2.48E-08
2.60E-08
2.46E-08
1.23E-08
60
3.17E-08
2.96E-08
2.87E-08
3.01E-08
3.17E-08
2.45E-08
2.40E-08
2.46E-08
2.58E-08
2.45E-08
1.24E-08
70
2.84E-08
2.74E-08
2.74E-08
2.76E-08
2.95E-08
2.22E-08
2.15E-08
2.23E-08
2.34E-08
2.22E-08
1.23E-08
1.35E-08
4.52E-10
1.56E-08
1.14E-08
1.61E-08
5.20E-10
1.86E-08
1.37E-08
1.99E-08
6.57E-10
2.30E-08
1.68E-08
2.31E-08
1.05E-09
2.80E-08
1.82E-08
3.02E-08
1.29E-09
3.62E-08
2.42E-08
3.04E-08
1.30E-09
3.64E-08
2.43E-08
2.81E-08
9.13E-10
3.23E-08
2.38E-08
1.33E-08
5.75E-10
1.60E-08
1.06E-08
-5.00E-08
PASS
5.00E-08
PASS
1.57E-08
5.77E-10
1.84E-08
1.30E-08
-8.00E-08
PASS
8.00E-08
PASS
1.82E-08
6.01E-10
2.10E-08
1.54E-08
-1.00E-07
PASS
1.00E-07
PASS
2.03E-08
6.25E-10
2.33E-08
1.74E-08
-1.00E-07
PASS
1.00E-07
PASS
2.49E-08
6.91E-10
2.81E-08
2.17E-08
-1.25E-07
PASS
1.25E-07
PASS
2.47E-08
6.84E-10
2.79E-08
2.15E-08
-1.25E-07
PASS
1.25E-07
PASS
2.23E-08
7.02E-10
2.56E-08
1.90E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
127
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 1 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.61. Plot of Negative Bias Current 1 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.61. Raw data for Negative Bias Current 1 @ +/-5V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 1 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.34E-08
1.21E-08
1.28E-08
1.28E-08
1.31E-08
1.28E-08
1.22E-08
1.23E-08
1.35E-08
1.28E-08
1.19E-08
10
1.63E-08
1.45E-08
1.53E-08
1.54E-08
1.56E-08
1.50E-08
1.45E-08
1.45E-08
1.58E-08
1.51E-08
1.20E-08
20
2.01E-08
1.81E-08
1.89E-08
1.90E-08
1.94E-08
1.74E-08
1.70E-08
1.69E-08
1.83E-08
1.75E-08
1.20E-08
30
2.34E-08
2.12E-08
2.12E-08
2.24E-08
2.26E-08
1.95E-08
1.89E-08
1.90E-08
2.04E-08
1.96E-08
1.19E-08
50
3.08E-08
2.80E-08
2.80E-08
2.93E-08
2.95E-08
2.40E-08
2.32E-08
2.32E-08
2.49E-08
2.40E-08
1.19E-08
60
3.09E-08
2.80E-08
2.81E-08
2.94E-08
2.96E-08
2.37E-08
2.31E-08
2.31E-08
2.48E-08
2.38E-08
1.19E-08
70
2.79E-08
2.57E-08
2.70E-08
2.70E-08
2.75E-08
2.17E-08
2.07E-08
2.10E-08
2.26E-08
2.18E-08
1.19E-08
1.28E-08
4.57E-10
1.50E-08
1.07E-08
1.54E-08
6.36E-10
1.84E-08
1.25E-08
1.91E-08
7.41E-10
2.25E-08
1.56E-08
2.22E-08
9.75E-10
2.67E-08
1.76E-08
2.91E-08
1.18E-09
3.46E-08
2.36E-08
2.92E-08
1.18E-09
3.47E-08
2.37E-08
2.70E-08
8.01E-10
3.07E-08
2.33E-08
1.27E-08
5.02E-10
1.51E-08
1.04E-08
-5.00E-08
PASS
5.00E-08
PASS
1.50E-08
5.24E-10
1.74E-08
1.26E-08
-8.00E-08
PASS
8.00E-08
PASS
1.74E-08
5.67E-10
2.01E-08
1.48E-08
-1.00E-07
PASS
1.00E-07
PASS
1.95E-08
6.11E-10
2.23E-08
1.66E-08
-1.00E-07
PASS
1.00E-07
PASS
2.38E-08
7.07E-10
2.71E-08
2.05E-08
-1.25E-07
PASS
1.25E-07
PASS
2.37E-08
6.92E-10
2.69E-08
2.05E-08
-1.25E-07
PASS
1.25E-07
PASS
2.16E-08
7.24E-10
2.49E-08
1.82E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
129
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 2 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.62. Plot of Negative Bias Current 2 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.62. Raw data for Negative Bias Current 2 @ +/-5V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 2 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.26E-08
1.36E-08
1.33E-08
1.32E-08
1.37E-08
1.37E-08
1.33E-08
1.26E-08
1.34E-08
1.39E-08
1.21E-08
10
1.52E-08
1.62E-08
1.59E-08
1.60E-08
1.65E-08
1.60E-08
1.56E-08
1.48E-08
1.58E-08
1.63E-08
1.21E-08
20
1.90E-08
2.01E-08
1.95E-08
1.97E-08
2.05E-08
1.84E-08
1.81E-08
1.72E-08
1.83E-08
1.90E-08
1.21E-08
30
2.22E-08
2.35E-08
2.22E-08
2.31E-08
2.40E-08
2.05E-08
2.01E-08
1.92E-08
2.04E-08
2.12E-08
1.21E-08
50
2.91E-08
3.06E-08
2.91E-08
3.03E-08
3.13E-08
2.49E-08
2.46E-08
2.36E-08
2.49E-08
2.59E-08
1.20E-08
60
2.92E-08
3.08E-08
2.93E-08
3.03E-08
3.14E-08
2.48E-08
2.45E-08
2.35E-08
2.48E-08
2.58E-08
1.20E-08
70
2.64E-08
2.86E-08
2.75E-08
2.78E-08
2.89E-08
2.25E-08
2.21E-08
2.12E-08
2.25E-08
2.34E-08
1.20E-08
1.33E-08
4.39E-10
1.53E-08
1.12E-08
1.60E-08
4.79E-10
1.82E-08
1.37E-08
1.97E-08
5.72E-10
2.24E-08
1.71E-08
2.30E-08
7.96E-10
2.67E-08
1.93E-08
3.01E-08
9.43E-10
3.45E-08
2.57E-08
3.02E-08
9.48E-10
3.46E-08
2.58E-08
2.78E-08
9.84E-10
3.24E-08
2.32E-08
1.34E-08
4.96E-10
1.57E-08
1.10E-08
-5.00E-08
PASS
5.00E-08
PASS
1.57E-08
5.56E-10
1.83E-08
1.31E-08
-8.00E-08
PASS
8.00E-08
PASS
1.82E-08
6.59E-10
2.13E-08
1.51E-08
-1.00E-07
PASS
1.00E-07
PASS
2.03E-08
7.04E-10
2.36E-08
1.70E-08
-1.00E-07
PASS
1.00E-07
PASS
2.48E-08
8.42E-10
2.87E-08
2.09E-08
-1.25E-07
PASS
1.25E-07
PASS
2.47E-08
8.36E-10
2.86E-08
2.08E-08
-1.25E-07
PASS
1.25E-07
PASS
2.24E-08
8.19E-10
2.62E-08
1.85E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
131
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 3 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.63. Plot of Negative Bias Current 3 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.63. Raw data for Negative Bias Current 3 @ +/-5V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 3 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.22E-08
1.31E-08
1.26E-08
1.34E-08
1.32E-08
1.32E-08
1.25E-08
1.20E-08
1.30E-08
1.27E-08
1.16E-08
10
1.46E-08
1.56E-08
1.52E-08
1.61E-08
1.59E-08
1.53E-08
1.46E-08
1.41E-08
1.54E-08
1.49E-08
1.16E-08
20
1.83E-08
1.92E-08
1.85E-08
1.98E-08
1.98E-08
1.76E-08
1.71E-08
1.64E-08
1.78E-08
1.73E-08
1.16E-08
30
2.15E-08
2.26E-08
2.29E-08
2.33E-08
2.33E-08
1.97E-08
1.91E-08
1.85E-08
1.98E-08
1.95E-08
1.16E-08
50
2.81E-08
2.94E-08
2.89E-08
3.04E-08
3.05E-08
2.39E-08
2.34E-08
2.26E-08
2.43E-08
2.39E-08
1.15E-08
60
2.82E-08
2.95E-08
2.91E-08
3.05E-08
3.06E-08
2.37E-08
2.32E-08
2.24E-08
2.41E-08
2.37E-08
1.16E-08
70
2.55E-08
2.74E-08
2.69E-08
2.80E-08
2.81E-08
2.17E-08
2.12E-08
2.03E-08
2.17E-08
2.16E-08
1.16E-08
1.29E-08
4.89E-10
1.52E-08
1.06E-08
1.55E-08
5.88E-10
1.82E-08
1.27E-08
1.91E-08
7.15E-10
2.25E-08
1.58E-08
2.27E-08
7.39E-10
2.62E-08
1.93E-08
2.95E-08
1.01E-09
3.42E-08
2.47E-08
2.96E-08
1.02E-09
3.43E-08
2.48E-08
2.72E-08
1.04E-09
3.20E-08
2.23E-08
1.27E-08
4.82E-10
1.49E-08
1.04E-08
-5.00E-08
PASS
5.00E-08
PASS
1.49E-08
5.18E-10
1.73E-08
1.24E-08
-8.00E-08
PASS
8.00E-08
PASS
1.73E-08
5.43E-10
1.98E-08
1.47E-08
-1.00E-07
PASS
1.00E-07
PASS
1.93E-08
5.52E-10
2.19E-08
1.67E-08
-1.00E-07
PASS
1.00E-07
PASS
2.36E-08
6.52E-10
2.67E-08
2.06E-08
-1.25E-07
PASS
1.25E-07
PASS
2.34E-08
6.38E-10
2.64E-08
2.05E-08
-1.25E-07
PASS
1.25E-07
PASS
2.13E-08
5.92E-10
2.41E-08
1.86E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
133
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 4 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.64. Plot of Negative Bias Current 4 @ +/-5V (A) versus total dose. The data show no significant
degradation with radiation. The solid diamonds are the average of measured data points from the biased
sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
134
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.64. Raw data for Negative Bias Current 4 @ +/-5V (A) versus total dose, including
the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Bias Current 4 @ +5V (A)
Total Dose (krad(Si))
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.36E-08
1.31E-08
1.33E-08
1.33E-08
1.41E-08
1.32E-08
1.28E-08
1.34E-08
1.40E-08
1.32E-08
1.23E-08
10
1.68E-08
1.57E-08
1.58E-08
1.61E-08
1.68E-08
1.55E-08
1.51E-08
1.57E-08
1.63E-08
1.54E-08
1.24E-08
20
2.07E-08
1.94E-08
1.95E-08
1.98E-08
2.08E-08
1.79E-08
1.75E-08
1.82E-08
1.89E-08
1.80E-08
1.24E-08
30
2.42E-08
2.29E-08
2.46E-08
2.33E-08
2.42E-08
2.01E-08
1.97E-08
2.04E-08
2.11E-08
2.01E-08
1.24E-08
50
3.19E-08
2.98E-08
3.08E-08
3.04E-08
3.16E-08
2.47E-08
2.42E-08
2.48E-08
2.58E-08
2.45E-08
1.23E-08
60
3.19E-08
2.99E-08
3.10E-08
3.05E-08
3.17E-08
2.44E-08
2.39E-08
2.46E-08
2.55E-08
2.44E-08
1.24E-08
70
2.86E-08
2.77E-08
2.86E-08
2.79E-08
2.95E-08
2.23E-08
2.17E-08
2.26E-08
2.33E-08
2.23E-08
1.24E-08
1.35E-08
4.10E-10
1.54E-08
1.16E-08
1.62E-08
5.40E-10
1.88E-08
1.37E-08
2.00E-08
6.74E-10
2.32E-08
1.69E-08
2.39E-08
7.26E-10
2.72E-08
2.05E-08
3.09E-08
8.37E-10
3.48E-08
2.70E-08
3.10E-08
8.35E-10
3.49E-08
2.71E-08
2.85E-08
6.75E-10
3.16E-08
2.53E-08
1.33E-08
4.65E-10
1.55E-08
1.11E-08
-5.00E-08
PASS
5.00E-08
PASS
1.56E-08
4.54E-10
1.77E-08
1.35E-08
-8.00E-08
PASS
8.00E-08
PASS
1.81E-08
5.00E-10
2.04E-08
1.58E-08
-1.00E-07
PASS
1.00E-07
PASS
2.03E-08
5.30E-10
2.28E-08
1.78E-08
-1.00E-07
PASS
1.00E-07
PASS
2.48E-08
6.10E-10
2.76E-08
2.19E-08
-1.25E-07
PASS
1.25E-07
PASS
2.46E-08
5.89E-10
2.73E-08
2.18E-08
-1.25E-07
PASS
1.25E-07
PASS
2.24E-08
5.82E-10
2.52E-08
1.97E-08
-1.25E-07
PASS
1.25E-07
PASS
An ISO 9001:2000 Certified Company
135
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 1 RL=open @ +5V (V)
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.65. Plot of Positive Output Voltage 1 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
136
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.65. Raw data for Positive Output Voltage 1 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 1 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.26E+00
4.27E+00
4.27E+00
4.27E+00
10
4.27E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.28E+00
20
4.27E+00
4.28E+00
4.28E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.27E+00
30
4.28E+00
4.28E+00
4.29E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.26E+00
4.27E+00
4.26E+00
4.27E+00
50
4.30E+00
4.30E+00
4.30E+00
4.30E+00
4.30E+00
4.28E+00
4.28E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
60
4.31E+00
4.30E+00
4.30E+00
4.30E+00
4.30E+00
4.28E+00
4.28E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
70
4.31E+00
4.30E+00
4.30E+00
4.30E+00
4.30E+00
4.29E+00
4.28E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
4.27E+00
3.90E-03
4.29E+00
4.25E+00
4.27E+00
6.02E-03
4.30E+00
4.25E+00
4.27E+00
4.16E-03
4.29E+00
4.25E+00
4.28E+00
8.23E-03
4.32E+00
4.24E+00
4.30E+00
1.79E-03
4.31E+00
4.29E+00
4.30E+00
2.07E-03
4.31E+00
4.29E+00
4.30E+00
1.92E-03
4.31E+00
4.29E+00
4.27E+00
2.86E-03
4.28E+00
4.25E+00
4.00E+00
PASS
4.26E+00
1.48E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
2.12E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.27E+00
2.41E-03
4.28E+00
4.25E+00
4.00E+00
PASS
4.27E+00
3.03E-03
4.29E+00
4.26E+00
4.00E+00
PASS
4.27E+00
2.97E-03
4.29E+00
4.26E+00
4.00E+00
PASS
4.28E+00
3.39E-03
4.30E+00
4.26E+00
4.00E+00
PASS
An ISO 9001:2000 Certified Company
137
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 2 RL=open @ +5V (V)
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.66. Plot of Positive Output Voltage 2 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
138
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.66. Raw data for Positive Output Voltage 2 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 2 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.26E+00
10
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
20
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
30
4.26E+00
4.26E+00
4.27E+00
4.26E+00
4.26E+00
4.25E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.26E+00
50
4.28E+00
4.28E+00
4.28E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
60
4.28E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
70
4.29E+00
4.29E+00
4.29E+00
4.29E+00
4.28E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
1.58E-03
4.26E+00
4.25E+00
4.26E+00
2.07E-03
4.27E+00
4.25E+00
4.26E+00
2.07E-03
4.27E+00
4.25E+00
4.26E+00
2.83E-03
4.28E+00
4.25E+00
4.28E+00
2.61E-03
4.29E+00
4.26E+00
4.28E+00
2.88E-03
4.29E+00
4.26E+00
4.29E+00
3.56E-03
4.30E+00
4.27E+00
4.25E+00
3.08E-03
4.27E+00
4.24E+00
4.00E+00
PASS
4.25E+00
3.35E-03
4.26E+00
4.23E+00
4.00E+00
PASS
4.25E+00
3.35E-03
4.27E+00
4.23E+00
4.00E+00
PASS
4.25E+00
2.61E-03
4.26E+00
4.24E+00
4.00E+00
PASS
4.26E+00
2.51E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
2.30E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
2.83E-03
4.28E+00
4.25E+00
4.00E+00
PASS
An ISO 9001:2000 Certified Company
139
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 3 RL=open @ +5V (V)
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.67. Plot of Positive Output Voltage 3 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
140
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.67. Raw data for Positive Output Voltage 3 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 3 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.26E+00
4.27E+00
4.26E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
10
4.28E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.27E+00
4.26E+00
4.26E+00
4.27E+00
20
4.27E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.27E+00
4.26E+00
4.26E+00
4.27E+00
30
4.28E+00
4.28E+00
4.29E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
50
4.30E+00
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.28E+00
4.27E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
60
4.30E+00
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.27E+00
4.27E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
70
4.30E+00
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.28E+00
4.27E+00
4.29E+00
4.28E+00
4.28E+00
4.27E+00
4.27E+00
3.94E-03
4.29E+00
4.25E+00
4.27E+00
4.38E-03
4.29E+00
4.25E+00
4.27E+00
4.06E-03
4.29E+00
4.25E+00
4.28E+00
6.77E-03
4.31E+00
4.25E+00
4.30E+00
3.54E-03
4.32E+00
4.29E+00
4.30E+00
3.36E-03
4.32E+00
4.29E+00
4.30E+00
3.16E-03
4.32E+00
4.29E+00
4.27E+00
4.38E-03
4.29E+00
4.25E+00
4.00E+00
PASS
4.26E+00
3.36E-03
4.28E+00
4.24E+00
4.00E+00
PASS
4.26E+00
3.35E-03
4.28E+00
4.25E+00
4.00E+00
PASS
4.27E+00
3.63E-03
4.28E+00
4.25E+00
4.00E+00
PASS
4.27E+00
4.71E-03
4.30E+00
4.25E+00
4.00E+00
PASS
4.27E+00
4.69E-03
4.30E+00
4.25E+00
4.00E+00
PASS
4.28E+00
5.34E-03
4.30E+00
4.26E+00
4.00E+00
PASS
An ISO 9001:2000 Certified Company
141
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 4 RL=open @ +5V (V)
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.68. Plot of Positive Output Voltage 4 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
142
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.68. Raw data for Positive Output Voltage 4 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 4 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
4.25E+00
4.26E+00
4.25E+00
4.26E+00
4.25E+00
4.25E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
10
4.25E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
20
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
30
4.26E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.25E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
50
4.27E+00
4.29E+00
4.29E+00
4.28E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
60
4.27E+00
4.29E+00
4.29E+00
4.28E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
70
4.28E+00
4.30E+00
4.30E+00
4.29E+00
4.28E+00
4.26E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
3.70E-03
4.27E+00
4.24E+00
4.26E+00
4.85E-03
4.28E+00
4.24E+00
4.26E+00
3.90E-03
4.28E+00
4.24E+00
4.26E+00
5.07E-03
4.29E+00
4.24E+00
4.28E+00
7.62E-03
4.31E+00
4.24E+00
4.28E+00
7.62E-03
4.32E+00
4.24E+00
4.29E+00
1.20E-02
4.35E+00
4.23E+00
4.25E+00
1.58E-03
4.26E+00
4.25E+00
4.00E+00
PASS
4.25E+00
1.52E-03
4.26E+00
4.24E+00
4.00E+00
PASS
4.25E+00
1.64E-03
4.26E+00
4.24E+00
4.00E+00
PASS
4.25E+00
1.48E-03
4.26E+00
4.25E+00
4.00E+00
PASS
4.26E+00
1.92E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
1.82E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
1.58E-03
4.27E+00
4.26E+00
4.00E+00
PASS
An ISO 9001:2000 Certified Company
143
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 5 RL=600 @ +5V (V)
3.90E+00
3.70E+00
3.50E+00
3.30E+00
3.10E+00
2.90E+00
2.70E+00
2.50E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.69. Plot of Positive Output Voltage 5 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
144
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.69. Raw data for Positive Output Voltage 5 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 5 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.81E+00
3.80E+00
3.82E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
10
3.83E+00
3.81E+00
3.81E+00
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
3.82E+00
3.82E+00
20
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.81E+00
3.80E+00
3.82E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
30
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.81E+00
3.80E+00
3.82E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
50
3.83E+00
3.81E+00
3.80E+00
3.82E+00
3.80E+00
3.80E+00
3.82E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
60
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.80E+00
3.80E+00
3.82E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
70
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.80E+00
3.80E+00
3.82E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
3.82E+00
1.11E-02
3.87E+00
3.76E+00
3.82E+00
1.10E-02
3.87E+00
3.77E+00
3.82E+00
1.13E-02
3.87E+00
3.76E+00
3.82E+00
1.16E-02
3.87E+00
3.76E+00
3.81E+00
1.18E-02
3.87E+00
3.76E+00
3.81E+00
1.16E-02
3.87E+00
3.76E+00
3.81E+00
1.18E-02
3.87E+00
3.76E+00
3.81E+00
6.58E-03
3.85E+00
3.78E+00
3.40E+00
PASS
3.82E+00
6.82E-03
3.85E+00
3.79E+00
3.40E+00
PASS
3.82E+00
6.88E-03
3.85E+00
3.78E+00
3.20E+00
PASS
3.81E+00
7.18E-03
3.85E+00
3.78E+00
3.20E+00
PASS
3.81E+00
7.09E-03
3.84E+00
3.78E+00
3.00E+00
PASS
3.81E+00
6.76E-03
3.84E+00
3.78E+00
3.00E+00
PASS
3.81E+00
6.82E-03
3.84E+00
3.78E+00
3.00E+00
PASS
An ISO 9001:2000 Certified Company
145
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 6 RL=600 @ +5V (V)
3.90E+00
3.70E+00
3.50E+00
3.30E+00
3.10E+00
2.90E+00
2.70E+00
2.50E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.70. Plot of Positive Output Voltage 6 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
146
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.70. Raw data for Positive Output Voltage 6 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 6 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
3.82E+00
3.82E+00
3.84E+00
3.81E+00
3.81E+00
3.82E+00
3.85E+00
3.84E+00
3.81E+00
3.81E+00
3.84E+00
10
3.82E+00
3.83E+00
3.84E+00
3.81E+00
3.82E+00
3.82E+00
3.86E+00
3.85E+00
3.81E+00
3.81E+00
3.84E+00
20
3.82E+00
3.82E+00
3.84E+00
3.81E+00
3.82E+00
3.82E+00
3.86E+00
3.85E+00
3.81E+00
3.81E+00
3.84E+00
30
3.82E+00
3.82E+00
3.84E+00
3.81E+00
3.82E+00
3.82E+00
3.86E+00
3.85E+00
3.81E+00
3.81E+00
3.84E+00
50
3.82E+00
3.82E+00
3.84E+00
3.81E+00
3.81E+00
3.81E+00
3.85E+00
3.84E+00
3.81E+00
3.81E+00
3.84E+00
60
3.82E+00
3.82E+00
3.84E+00
3.81E+00
3.81E+00
3.81E+00
3.85E+00
3.84E+00
3.81E+00
3.81E+00
3.84E+00
70
3.82E+00
3.82E+00
3.84E+00
3.81E+00
3.81E+00
3.81E+00
3.85E+00
3.84E+00
3.81E+00
3.81E+00
3.84E+00
3.82E+00
1.23E-02
3.88E+00
3.76E+00
3.82E+00
1.24E-02
3.88E+00
3.77E+00
3.82E+00
1.26E-02
3.88E+00
3.76E+00
3.82E+00
1.24E-02
3.88E+00
3.76E+00
3.82E+00
1.30E-02
3.88E+00
3.76E+00
3.82E+00
1.28E-02
3.88E+00
3.76E+00
3.82E+00
1.28E-02
3.88E+00
3.76E+00
3.83E+00
2.03E-02
3.92E+00
3.73E+00
3.40E+00
PASS
3.83E+00
2.05E-02
3.93E+00
3.73E+00
3.40E+00
PASS
3.83E+00
2.15E-02
3.93E+00
3.73E+00
3.20E+00
PASS
3.83E+00
2.08E-02
3.92E+00
3.73E+00
3.20E+00
PASS
3.83E+00
2.14E-02
3.92E+00
3.73E+00
3.00E+00
PASS
3.83E+00
2.15E-02
3.93E+00
3.72E+00
3.00E+00
PASS
3.83E+00
2.12E-02
3.93E+00
3.73E+00
3.00E+00
PASS
An ISO 9001:2000 Certified Company
147
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 7 RL=600 @ +5V (V)
3.90E+00
3.70E+00
3.50E+00
3.30E+00
3.10E+00
2.90E+00
2.70E+00
2.50E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.71. Plot of Positive Output Voltage 7 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
148
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.71. Raw data for Positive Output Voltage 7 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 7 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
3.81E+00
3.81E+00
3.83E+00
3.80E+00
3.81E+00
3.81E+00
3.85E+00
3.83E+00
3.80E+00
3.80E+00
3.83E+00
10
3.81E+00
3.82E+00
3.84E+00
3.81E+00
3.81E+00
3.81E+00
3.85E+00
3.84E+00
3.81E+00
3.80E+00
3.83E+00
20
3.81E+00
3.82E+00
3.84E+00
3.81E+00
3.81E+00
3.81E+00
3.85E+00
3.84E+00
3.81E+00
3.80E+00
3.83E+00
30
3.81E+00
3.82E+00
3.83E+00
3.80E+00
3.81E+00
3.81E+00
3.85E+00
3.84E+00
3.80E+00
3.80E+00
3.83E+00
50
3.81E+00
3.81E+00
3.83E+00
3.80E+00
3.81E+00
3.80E+00
3.85E+00
3.83E+00
3.80E+00
3.80E+00
3.83E+00
60
3.81E+00
3.81E+00
3.83E+00
3.80E+00
3.81E+00
3.80E+00
3.85E+00
3.83E+00
3.80E+00
3.80E+00
3.83E+00
70
3.81E+00
3.81E+00
3.83E+00
3.80E+00
3.81E+00
3.80E+00
3.85E+00
3.83E+00
3.80E+00
3.80E+00
3.83E+00
3.81E+00
1.10E-02
3.87E+00
3.76E+00
3.82E+00
1.11E-02
3.87E+00
3.76E+00
3.82E+00
1.15E-02
3.87E+00
3.76E+00
3.82E+00
1.14E-02
3.87E+00
3.76E+00
3.81E+00
1.17E-02
3.87E+00
3.76E+00
3.81E+00
1.17E-02
3.87E+00
3.76E+00
3.81E+00
1.14E-02
3.87E+00
3.76E+00
3.82E+00
2.02E-02
3.91E+00
3.72E+00
3.40E+00
PASS
3.82E+00
2.06E-02
3.92E+00
3.72E+00
3.40E+00
PASS
3.82E+00
2.10E-02
3.92E+00
3.72E+00
3.20E+00
PASS
3.82E+00
2.13E-02
3.92E+00
3.72E+00
3.20E+00
PASS
3.82E+00
2.15E-02
3.92E+00
3.72E+00
3.00E+00
PASS
3.82E+00
2.16E-02
3.92E+00
3.72E+00
3.00E+00
PASS
3.82E+00
2.15E-02
3.92E+00
3.72E+00
3.00E+00
PASS
An ISO 9001:2000 Certified Company
149
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 8 RL=600 @ +5V (V)
3.90E+00
3.70E+00
3.50E+00
3.30E+00
3.10E+00
2.90E+00
2.70E+00
2.50E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.72. Plot of Positive Output Voltage 8 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.72. Raw data for Positive Output Voltage 8 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Positive Output Voltage 8 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
3.84E+00
3.82E+00
3.82E+00
3.83E+00
3.81E+00
3.81E+00
3.83E+00
3.82E+00
3.83E+00
3.83E+00
3.83E+00
10
3.84E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00
3.81E+00
3.83E+00
3.82E+00
3.83E+00
3.83E+00
3.83E+00
20
3.84E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00
3.81E+00
3.83E+00
3.82E+00
3.83E+00
3.83E+00
3.83E+00
30
3.84E+00
3.82E+00
3.82E+00
3.83E+00
3.81E+00
3.81E+00
3.83E+00
3.82E+00
3.83E+00
3.83E+00
3.83E+00
50
3.84E+00
3.82E+00
3.81E+00
3.83E+00
3.81E+00
3.81E+00
3.82E+00
3.82E+00
3.82E+00
3.83E+00
3.83E+00
60
3.84E+00
3.82E+00
3.81E+00
3.83E+00
3.81E+00
3.81E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.83E+00
70
3.84E+00
3.82E+00
3.81E+00
3.83E+00
3.81E+00
3.81E+00
3.83E+00
3.82E+00
3.83E+00
3.83E+00
3.83E+00
3.82E+00
1.04E-02
3.87E+00
3.78E+00
3.83E+00
1.01E-02
3.87E+00
3.78E+00
3.82E+00
1.01E-02
3.87E+00
3.78E+00
3.82E+00
1.06E-02
3.87E+00
3.77E+00
3.82E+00
1.06E-02
3.87E+00
3.77E+00
3.82E+00
1.04E-02
3.87E+00
3.77E+00
3.82E+00
1.04E-02
3.87E+00
3.77E+00
3.82E+00
6.88E-03
3.85E+00
3.79E+00
3.40E+00
PASS
3.82E+00
7.22E-03
3.86E+00
3.79E+00
3.40E+00
PASS
3.82E+00
7.29E-03
3.86E+00
3.79E+00
3.20E+00
PASS
3.82E+00
7.29E-03
3.86E+00
3.79E+00
3.20E+00
PASS
3.82E+00
7.57E-03
3.85E+00
3.78E+00
3.00E+00
PASS
3.82E+00
7.44E-03
3.86E+00
3.79E+00
3.00E+00
PASS
3.82E+00
7.31E-03
3.86E+00
3.79E+00
3.00E+00
PASS
An ISO 9001:2000 Certified Company
151
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 1 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.73. Plot of Negative Output Voltage 1 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
152
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.73. Raw data for Negative Output Voltage 1 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 1 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.37E-02
1.37E-02
1.35E-02
1.37E-02
1.36E-02
1.36E-02
1.39E-02
1.37E-02
1.37E-02
1.36E-02
1.37E-02
10
1.37E-02
1.38E-02
1.38E-02
1.39E-02
1.37E-02
1.37E-02
1.39E-02
1.38E-02
1.38E-02
1.38E-02
1.38E-02
20
1.38E-02
1.38E-02
1.38E-02
1.39E-02
1.37E-02
1.39E-02
1.39E-02
1.38E-02
1.39E-02
1.39E-02
1.38E-02
30
1.39E-02
1.39E-02
1.40E-02
1.40E-02
1.38E-02
1.40E-02
1.39E-02
1.39E-02
1.39E-02
1.40E-02
1.38E-02
50
1.40E-02
1.38E-02
1.39E-02
1.40E-02
1.39E-02
1.39E-02
1.40E-02
1.40E-02
1.41E-02
1.40E-02
1.37E-02
60
1.39E-02
1.39E-02
1.40E-02
1.39E-02
1.38E-02
1.40E-02
1.41E-02
1.40E-02
1.40E-02
1.40E-02
1.37E-02
70
1.40E-02
1.39E-02
1.38E-02
1.40E-02
1.39E-02
1.38E-02
1.39E-02
1.38E-02
1.39E-02
1.39E-02
1.38E-02
1.36E-02
8.94E-05
1.41E-02
1.32E-02
1.38E-02
8.37E-05
1.42E-02
1.34E-02
1.38E-02
7.07E-05
1.41E-02
1.35E-02
1.39E-02
8.37E-05
1.43E-02
1.35E-02
1.39E-02
8.37E-05
1.43E-02
1.35E-02
1.39E-02
7.07E-05
1.42E-02
1.36E-02
1.39E-02
8.37E-05
1.43E-02
1.35E-02
1.37E-02
1.22E-04
1.43E-02
1.31E-02
2.50E-02
PASS
1.38E-02
7.07E-05
1.41E-02
1.35E-02
2.50E-02
PASS
1.39E-02
4.47E-05
1.41E-02
1.37E-02
3.00E-02
PASS
1.39E-02
5.48E-05
1.42E-02
1.37E-02
3.00E-02
PASS
1.40E-02
7.07E-05
1.43E-02
1.37E-02
4.00E-02
PASS
1.40E-02
4.47E-05
1.42E-02
1.38E-02
4.00E-02
PASS
1.39E-02
5.48E-05
1.41E-02
1.36E-02
4.00E-02
PASS
An ISO 9001:2000 Certified Company
153
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 2 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.74. Plot of Negative Output Voltage 2 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.74. Raw data for Negative Output Voltage 2 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 2 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.37E-02
1.36E-02
1.40E-02
1.36E-02
1.36E-02
1.36E-02
1.42E-02
1.39E-02
1.36E-02
1.36E-02
1.36E-02
10
1.37E-02
1.38E-02
1.41E-02
1.37E-02
1.37E-02
1.37E-02
1.43E-02
1.41E-02
1.37E-02
1.37E-02
1.37E-02
20
1.38E-02
1.38E-02
1.41E-02
1.37E-02
1.38E-02
1.37E-02
1.44E-02
1.42E-02
1.38E-02
1.37E-02
1.39E-02
30
1.38E-02
1.38E-02
1.40E-02
1.38E-02
1.39E-02
1.38E-02
1.44E-02
1.41E-02
1.38E-02
1.39E-02
1.38E-02
50
1.38E-02
1.39E-02
1.40E-02
1.38E-02
1.37E-02
1.38E-02
1.44E-02
1.41E-02
1.39E-02
1.40E-02
1.37E-02
60
1.38E-02
1.38E-02
1.40E-02
1.38E-02
1.39E-02
1.39E-02
1.44E-02
1.41E-02
1.38E-02
1.39E-02
1.37E-02
70
1.38E-02
1.38E-02
1.41E-02
1.38E-02
1.38E-02
1.39E-02
1.44E-02
1.41E-02
1.38E-02
1.39E-02
1.38E-02
1.37E-02
1.73E-04
1.45E-02
1.29E-02
1.38E-02
1.73E-04
1.46E-02
1.30E-02
1.38E-02
1.52E-04
1.45E-02
1.31E-02
1.39E-02
8.94E-05
1.43E-02
1.34E-02
1.38E-02
1.14E-04
1.44E-02
1.33E-02
1.39E-02
8.94E-05
1.43E-02
1.34E-02
1.39E-02
1.34E-04
1.45E-02
1.32E-02
1.38E-02
2.68E-04
1.50E-02
1.25E-02
2.50E-02
PASS
1.39E-02
2.83E-04
1.52E-02
1.26E-02
2.50E-02
PASS
1.40E-02
3.21E-04
1.55E-02
1.25E-02
3.00E-02
PASS
1.40E-02
2.55E-04
1.52E-02
1.28E-02
3.00E-02
PASS
1.40E-02
2.30E-04
1.51E-02
1.30E-02
4.00E-02
PASS
1.40E-02
2.39E-04
1.51E-02
1.29E-02
4.00E-02
PASS
1.40E-02
2.39E-04
1.51E-02
1.29E-02
4.00E-02
PASS
An ISO 9001:2000 Certified Company
155
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 3 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.75. Plot of Negative Output Voltage 3 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.75. Raw data for Negative Output Voltage 3 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 3 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.38E-02
1.36E-02
1.38E-02
1.36E-02
1.36E-02
1.35E-02
1.40E-02
1.41E-02
1.36E-02
1.36E-02
1.38E-02
10
1.38E-02
1.38E-02
1.41E-02
1.39E-02
1.37E-02
1.37E-02
1.42E-02
1.42E-02
1.38E-02
1.38E-02
1.38E-02
20
1.39E-02
1.39E-02
1.41E-02
1.38E-02
1.38E-02
1.39E-02
1.42E-02
1.43E-02
1.38E-02
1.39E-02
1.39E-02
30
1.39E-02
1.39E-02
1.41E-02
1.39E-02
1.39E-02
1.38E-02
1.42E-02
1.43E-02
1.39E-02
1.39E-02
1.38E-02
50
1.40E-02
1.38E-02
1.40E-02
1.40E-02
1.39E-02
1.40E-02
1.42E-02
1.44E-02
1.39E-02
1.40E-02
1.38E-02
60
1.40E-02
1.40E-02
1.41E-02
1.39E-02
1.39E-02
1.39E-02
1.43E-02
1.44E-02
1.40E-02
1.41E-02
1.37E-02
70
1.40E-02
1.39E-02
1.41E-02
1.39E-02
1.39E-02
1.39E-02
1.42E-02
1.42E-02
1.38E-02
1.38E-02
1.39E-02
1.37E-02
1.10E-04
1.42E-02
1.32E-02
1.39E-02
1.52E-04
1.46E-02
1.32E-02
1.39E-02
1.22E-04
1.45E-02
1.33E-02
1.39E-02
8.94E-05
1.44E-02
1.35E-02
1.39E-02
8.94E-05
1.44E-02
1.35E-02
1.40E-02
8.37E-05
1.44E-02
1.36E-02
1.40E-02
8.94E-05
1.44E-02
1.35E-02
1.38E-02
2.70E-04
1.50E-02
1.25E-02
2.50E-02
PASS
1.39E-02
2.41E-04
1.51E-02
1.28E-02
2.50E-02
PASS
1.40E-02
2.17E-04
1.50E-02
1.30E-02
3.00E-02
PASS
1.40E-02
2.17E-04
1.50E-02
1.30E-02
3.00E-02
PASS
1.41E-02
2.00E-04
1.50E-02
1.32E-02
4.00E-02
PASS
1.41E-02
2.07E-04
1.51E-02
1.32E-02
4.00E-02
PASS
1.40E-02
2.05E-04
1.49E-02
1.30E-02
4.00E-02
PASS
An ISO 9001:2000 Certified Company
157
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Negative Output Voltage 4 RL=open @ +5V (V)
Specification MAX
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.76. Plot of Negative Output Voltage 4 RL=open @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.76. Raw data for Negative Output Voltage 4 RL=open @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 4 RL=open @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
1.36E-02
1.36E-02
1.37E-02
1.36E-02
1.35E-02
1.35E-02
1.38E-02
1.35E-02
1.36E-02
1.35E-02
1.38E-02
10
1.38E-02
1.36E-02
1.37E-02
1.38E-02
1.37E-02
1.38E-02
1.39E-02
1.38E-02
1.37E-02
1.38E-02
1.38E-02
20
1.38E-02
1.38E-02
1.38E-02
1.38E-02
1.36E-02
1.38E-02
1.40E-02
1.39E-02
1.38E-02
1.38E-02
1.36E-02
30
1.39E-02
1.38E-02
1.37E-02
1.39E-02
1.38E-02
1.38E-02
1.40E-02
1.38E-02
1.38E-02
1.39E-02
1.38E-02
50
1.39E-02
1.38E-02
1.37E-02
1.38E-02
1.37E-02
1.39E-02
1.41E-02
1.39E-02
1.39E-02
1.39E-02
1.36E-02
60
1.39E-02
1.39E-02
1.38E-02
1.38E-02
1.37E-02
1.39E-02
1.40E-02
1.39E-02
1.39E-02
1.38E-02
1.37E-02
70
1.39E-02
1.38E-02
1.38E-02
1.38E-02
1.37E-02
1.38E-02
1.40E-02
1.38E-02
1.38E-02
1.38E-02
1.37E-02
1.36E-02
7.07E-05
1.39E-02
1.33E-02
1.37E-02
8.37E-05
1.41E-02
1.33E-02
1.38E-02
8.94E-05
1.42E-02
1.33E-02
1.38E-02
8.37E-05
1.42E-02
1.34E-02
1.38E-02
8.37E-05
1.42E-02
1.34E-02
1.38E-02
8.37E-05
1.42E-02
1.34E-02
1.38E-02
7.07E-05
1.41E-02
1.35E-02
1.36E-02
1.30E-04
1.42E-02
1.30E-02
2.50E-02
PASS
1.38E-02
7.07E-05
1.41E-02
1.35E-02
2.50E-02
PASS
1.39E-02
8.94E-05
1.43E-02
1.34E-02
3.00E-02
PASS
1.39E-02
8.94E-05
1.43E-02
1.34E-02
3.00E-02
PASS
1.39E-02
8.94E-05
1.44E-02
1.35E-02
4.00E-02
PASS
1.39E-02
7.07E-05
1.42E-02
1.36E-02
4.00E-02
PASS
1.38E-02
8.94E-05
1.43E-02
1.34E-02
4.00E-02
PASS
An ISO 9001:2000 Certified Company
159
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Negative Output Voltage 5 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.77. Plot of Negative Output Voltage 5 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.77. Raw data for Negative Output Voltage 5 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 5 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
5.70E-03
5.60E-03
5.50E-03
5.90E-03
5.60E-03
5.40E-03
5.70E-03
5.50E-03
5.70E-03
5.80E-03
5.70E-03
10
6.00E-03
5.70E-03
5.70E-03
5.80E-03
5.60E-03
5.70E-03
5.90E-03
5.90E-03
5.90E-03
5.90E-03
5.80E-03
20
5.90E-03
5.60E-03
5.60E-03
5.70E-03
5.60E-03
5.60E-03
5.90E-03
5.80E-03
5.80E-03
5.80E-03
5.90E-03
30
5.80E-03
5.60E-03
5.50E-03
5.70E-03
5.60E-03
5.60E-03
5.80E-03
5.70E-03
5.80E-03
5.80E-03
5.80E-03
50
5.70E-03
5.50E-03
5.40E-03
5.50E-03
5.50E-03
5.50E-03
5.60E-03
5.60E-03
5.60E-03
5.70E-03
5.80E-03
60
5.80E-03
5.50E-03
5.50E-03
5.50E-03
5.50E-03
5.50E-03
5.70E-03
5.60E-03
5.70E-03
5.70E-03
5.80E-03
70
5.70E-03
5.40E-03
5.40E-03
5.60E-03
5.50E-03
5.50E-03
5.60E-03
5.70E-03
5.80E-03
5.80E-03
5.80E-03
5.66E-03
1.52E-04
6.37E-03
4.95E-03
5.76E-03
1.52E-04
6.47E-03
5.05E-03
5.68E-03
1.30E-04
6.29E-03
5.07E-03
5.64E-03
1.14E-04
6.17E-03
5.11E-03
5.52E-03
1.10E-04
6.03E-03
5.01E-03
5.56E-03
1.34E-04
6.19E-03
4.93E-03
5.52E-03
1.30E-04
6.13E-03
4.91E-03
5.62E-03
1.64E-04
6.39E-03
4.85E-03
1.00E-02
PASS
5.86E-03
8.94E-05
6.28E-03
5.44E-03
1.00E-02
PASS
5.78E-03
1.10E-04
6.29E-03
5.27E-03
1.00E-02
PASS
5.74E-03
8.94E-05
6.16E-03
5.32E-03
1.00E-02
PASS
5.60E-03
7.07E-05
5.93E-03
5.27E-03
1.00E-02
PASS
5.64E-03
8.94E-05
6.06E-03
5.22E-03
1.00E-02
PASS
5.68E-03
1.30E-04
6.29E-03
5.07E-03
1.00E-02
PASS
An ISO 9001:2000 Certified Company
161
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 6 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.78. Plot of Negative Output Voltage 6 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
162
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.78. Raw data for Negative Output Voltage 6 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 6 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
5.80E-03
5.80E-03
6.00E-03
5.80E-03
5.80E-03
5.90E-03
6.20E-03
6.00E-03
5.80E-03
5.80E-03
6.10E-03
10
6.00E-03
5.90E-03
6.10E-03
5.90E-03
5.90E-03
6.10E-03
6.50E-03
6.20E-03
6.00E-03
6.00E-03
6.20E-03
20
5.90E-03
5.90E-03
6.00E-03
5.80E-03
5.90E-03
5.90E-03
6.40E-03
6.10E-03
5.90E-03
5.90E-03
6.20E-03
30
5.80E-03
5.80E-03
5.90E-03
5.70E-03
5.80E-03
6.00E-03
6.20E-03
6.10E-03
5.80E-03
5.80E-03
6.10E-03
50
5.60E-03
5.70E-03
5.70E-03
5.70E-03
5.60E-03
5.90E-03
6.20E-03
5.90E-03
5.80E-03
5.70E-03
6.10E-03
60
5.70E-03
5.70E-03
5.80E-03
5.70E-03
5.60E-03
5.80E-03
6.30E-03
6.00E-03
5.70E-03
5.70E-03
6.10E-03
70
5.70E-03
5.70E-03
5.80E-03
5.50E-03
5.70E-03
5.90E-03
6.20E-03
6.00E-03
5.80E-03
5.70E-03
6.20E-03
5.84E-03
8.94E-05
6.26E-03
5.42E-03
5.96E-03
8.94E-05
6.38E-03
5.54E-03
5.90E-03
7.07E-05
6.23E-03
5.57E-03
5.80E-03
7.07E-05
6.13E-03
5.47E-03
5.66E-03
5.48E-05
5.92E-03
5.40E-03
5.70E-03
7.07E-05
6.03E-03
5.37E-03
5.68E-03
1.10E-04
6.19E-03
5.17E-03
5.94E-03
1.67E-04
6.72E-03
5.16E-03
1.00E-02
PASS
6.16E-03
2.07E-04
7.13E-03
5.19E-03
1.00E-02
PASS
6.04E-03
2.19E-04
7.06E-03
5.02E-03
1.00E-02
PASS
5.98E-03
1.79E-04
6.81E-03
5.15E-03
1.00E-02
PASS
5.90E-03
1.87E-04
6.77E-03
5.03E-03
1.00E-02
PASS
5.90E-03
2.55E-04
7.09E-03
4.71E-03
1.00E-02
PASS
5.92E-03
1.92E-04
6.82E-03
5.02E-03
1.00E-02
PASS
An ISO 9001:2000 Certified Company
163
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 7 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.79. Plot of Negative Output Voltage 7 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
164
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.79. Raw data for Negative Output Voltage 7 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 7 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
5.60E-03
5.70E-03
5.70E-03
5.50E-03
5.70E-03
5.60E-03
6.00E-03
6.00E-03
5.60E-03
5.60E-03
5.90E-03
10
5.80E-03
5.70E-03
5.80E-03
5.70E-03
5.70E-03
5.80E-03
6.30E-03
6.00E-03
5.80E-03
5.70E-03
6.10E-03
20
5.60E-03
5.70E-03
5.90E-03
5.70E-03
5.80E-03
5.80E-03
6.20E-03
5.90E-03
5.70E-03
5.70E-03
6.00E-03
30
5.70E-03
5.70E-03
5.70E-03
5.60E-03
5.70E-03
5.70E-03
6.10E-03
5.90E-03
5.70E-03
5.70E-03
6.00E-03
50
5.50E-03
5.60E-03
5.50E-03
5.40E-03
5.50E-03
5.60E-03
6.00E-03
5.90E-03
5.50E-03
5.60E-03
5.90E-03
60
5.50E-03
5.60E-03
5.60E-03
5.40E-03
5.50E-03
5.70E-03
6.00E-03
5.80E-03
5.70E-03
5.60E-03
5.90E-03
70
5.50E-03
5.50E-03
5.50E-03
5.50E-03
5.50E-03
5.70E-03
6.00E-03
5.80E-03
5.60E-03
5.60E-03
6.00E-03
5.64E-03
8.94E-05
6.06E-03
5.22E-03
5.74E-03
5.48E-05
6.00E-03
5.48E-03
5.74E-03
1.14E-04
6.27E-03
5.21E-03
5.68E-03
4.47E-05
5.89E-03
5.47E-03
5.50E-03
7.07E-05
5.83E-03
5.17E-03
5.52E-03
8.37E-05
5.91E-03
5.13E-03
5.50E-03
#######
5.50E-03
5.50E-03
5.76E-03
2.19E-04
6.78E-03
4.74E-03
1.00E-02
PASS
5.92E-03
2.39E-04
7.03E-03
4.81E-03
1.00E-02
PASS
5.86E-03
2.07E-04
6.83E-03
4.89E-03
1.00E-02
PASS
5.82E-03
1.79E-04
6.65E-03
4.99E-03
1.00E-02
PASS
5.72E-03
2.17E-04
6.73E-03
4.71E-03
1.00E-02
PASS
5.76E-03
1.52E-04
6.47E-03
5.05E-03
1.00E-02
PASS
5.74E-03
1.67E-04
6.52E-03
4.96E-03
1.00E-02
PASS
An ISO 9001:2000 Certified Company
165
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 8 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.80. Plot of Negative Output Voltage 8 RL=600 @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
166
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.80. Raw data for Negative Output Voltage 8 RL=600 @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 8 RL=600 @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
6.20E-03
5.90E-03
5.70E-03
6.00E-03
5.90E-03
5.70E-03
5.90E-03
5.80E-03
6.00E-03
6.00E-03
5.90E-03
10
6.40E-03
5.90E-03
6.00E-03
6.10E-03
6.00E-03
6.00E-03
6.20E-03
6.10E-03
6.30E-03
6.20E-03
6.20E-03
20
6.10E-03
6.00E-03
5.90E-03
6.10E-03
5.90E-03
5.90E-03
6.00E-03
6.00E-03
6.10E-03
6.00E-03
6.00E-03
30
6.10E-03
5.80E-03
5.70E-03
5.90E-03
5.80E-03
5.90E-03
6.00E-03
6.00E-03
6.10E-03
6.00E-03
6.00E-03
50
5.90E-03
5.70E-03
5.70E-03
5.80E-03
5.70E-03
5.70E-03
5.90E-03
5.80E-03
6.00E-03
6.00E-03
5.90E-03
60
5.90E-03
5.70E-03
5.70E-03
5.90E-03
5.70E-03
5.80E-03
5.90E-03
6.00E-03
6.00E-03
6.00E-03
6.00E-03
70
6.00E-03
5.60E-03
5.60E-03
5.90E-03
5.70E-03
5.70E-03
5.90E-03
5.90E-03
6.10E-03
5.90E-03
6.00E-03
5.94E-03
1.82E-04
6.79E-03
5.09E-03
6.08E-03
1.92E-04
6.98E-03
5.18E-03
6.00E-03
1.00E-04
6.47E-03
5.53E-03
5.86E-03
1.52E-04
6.57E-03
5.15E-03
5.76E-03
8.94E-05
6.18E-03
5.34E-03
5.78E-03
1.10E-04
6.29E-03
5.27E-03
5.76E-03
1.82E-04
6.61E-03
4.91E-03
5.88E-03
1.30E-04
6.49E-03
5.27E-03
1.00E-02
PASS
6.16E-03
1.14E-04
6.69E-03
5.63E-03
1.00E-02
PASS
6.00E-03
7.07E-05
6.33E-03
5.67E-03
1.00E-02
PASS
6.00E-03
7.07E-05
6.33E-03
5.67E-03
1.00E-02
PASS
5.88E-03
1.30E-04
6.49E-03
5.27E-03
1.00E-02
PASS
5.94E-03
8.94E-05
6.36E-03
5.52E-03
1.00E-02
PASS
5.90E-03
1.41E-04
6.56E-03
5.24E-03
1.00E-02
PASS
An ISO 9001:2000 Certified Company
167
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Negative Output Voltage 9 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.81. Plot of Negative Output Voltage 9 IL=1mA @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
168
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-199 090408 R1.2
Table 5.81. Raw data for Negative Output Voltage 9 IL=1mA @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 9 IL=1mA @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.44E-01
2.41E-01
2.44E-01
2.44E-01
2.45E-01
2.46E-01
2.45E-01
2.45E-01
2.42E-01
2.44E-01
2.40E-01
10
2.46E-01
2.44E-01
2.47E-01
2.47E-01
2.48E-01
2.47E-01
2.45E-01
2.46E-01
2.43E-01
2.44E-01
2.42E-01
20
2.48E-01
2.43E-01
2.47E-01
2.47E-01
2.48E-01
2.47E-01
2.46E-01
2.46E-01
2.44E-01
2.44E-01
2.42E-01
30
2.48E-01
2.45E-01
2.50E-01
2.48E-01
2.48E-01
2.47E-01
2.47E-01
2.47E-01
2.44E-01
2.45E-01
2.42E-01
50
2.51E-01
2.48E-01
2.53E-01
2.50E-01
2.51E-01
2.49E-01
2.47E-01
2.47E-01
2.45E-01
2.46E-01
2.40E-01
60
2.52E-01
2.48E-01
2.53E-01
2.50E-01
2.52E-01
2.50E-01
2.48E-01
2.48E-01
2.45E-01
2.46E-01
2.40E-01
70
2.53E-01
2.51E-01
2.56E-01
2.53E-01
2.54E-01
2.51E-01
2.49E-01
2.49E-01
2.47E-01
2.48E-01
2.41E-01
2.44E-01
1.52E-03
2.51E-01
2.37E-01
2.46E-01
1.52E-03
2.53E-01
2.39E-01
2.47E-01
2.07E-03
2.56E-01
2.37E-01
2.48E-01
1.79E-03
2.56E-01
2.39E-01
2.51E-01
1.82E-03
2.59E-01
2.42E-01
2.51E-01
2.00E-03
2.60E-01
2.42E-01
2.53E-01
1.82E-03
2.62E-01
2.45E-01
2.44E-01
1.52E-03
2.51E-01
2.37E-01
3.50E-01
PASS
2.45E-01
1.58E-03
2.52E-01
2.38E-01
6.00E-01
PASS
2.45E-01
1.34E-03
2.52E-01
2.39E-01
8.00E-01
PASS
2.46E-01
1.41E-03
2.53E-01
2.39E-01
8.00E-01
PASS
2.47E-01
1.48E-03
2.54E-01
2.40E-01
1.00E+00
PASS
2.47E-01
1.95E-03
2.56E-01
2.38E-01
1.00E+00
PASS
2.49E-01
1.48E-03
2.56E-01
2.42E-01
1.00E+00
PASS
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Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 10 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.82. Plot of Negative Output Voltage 10 IL=1mA @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
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Table 5.82. Raw data for Negative Output Voltage 10 IL=1mA @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 10 IL=1mA @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.40E-01
2.36E-01
2.30E-01
2.39E-01
2.40E-01
2.37E-01
2.32E-01
2.31E-01
2.40E-01
2.39E-01
2.34E-01
10
2.42E-01
2.38E-01
2.33E-01
2.42E-01
2.43E-01
2.38E-01
2.34E-01
2.31E-01
2.40E-01
2.41E-01
2.37E-01
20
2.42E-01
2.37E-01
2.33E-01
2.42E-01
2.43E-01
2.39E-01
2.34E-01
2.32E-01
2.41E-01
2.41E-01
2.36E-01
30
2.43E-01
2.38E-01
2.34E-01
2.43E-01
2.43E-01
2.39E-01
2.34E-01
2.32E-01
2.42E-01
2.42E-01
2.36E-01
50
2.45E-01
2.41E-01
2.36E-01
2.45E-01
2.46E-01
2.40E-01
2.35E-01
2.32E-01
2.42E-01
2.43E-01
2.34E-01
60
2.46E-01
2.41E-01
2.37E-01
2.46E-01
2.46E-01
2.40E-01
2.35E-01
2.33E-01
2.42E-01
2.43E-01
2.35E-01
70
2.48E-01
2.44E-01
2.40E-01
2.48E-01
2.48E-01
2.42E-01
2.36E-01
2.34E-01
2.44E-01
2.44E-01
2.36E-01
2.37E-01
4.24E-03
2.57E-01
2.17E-01
2.40E-01
4.16E-03
2.59E-01
2.20E-01
2.39E-01
4.28E-03
2.59E-01
2.19E-01
2.40E-01
4.09E-03
2.59E-01
2.21E-01
2.43E-01
4.16E-03
2.62E-01
2.23E-01
2.43E-01
4.09E-03
2.62E-01
2.24E-01
2.46E-01
3.58E-03
2.62E-01
2.29E-01
2.36E-01
4.09E-03
2.55E-01
2.17E-01
3.50E-01
PASS
2.37E-01
4.21E-03
2.56E-01
2.17E-01
6.00E-01
PASS
2.37E-01
4.16E-03
2.57E-01
2.18E-01
8.00E-01
PASS
2.38E-01
4.60E-03
2.59E-01
2.16E-01
8.00E-01
PASS
2.38E-01
4.72E-03
2.60E-01
2.16E-01
1.00E+00
PASS
2.39E-01
4.39E-03
2.59E-01
2.18E-01
1.00E+00
PASS
2.40E-01
4.69E-03
2.62E-01
2.18E-01
1.00E+00
PASS
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Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 11 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.83. Plot of Negative Output Voltage 11 IL=1mA @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
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Table 5.83. Raw data for Negative Output Voltage 11 IL=1mA @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 11 IL=1mA @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.44E-01
2.40E-01
2.36E-01
2.44E-01
2.44E-01
2.43E-01
2.36E-01
2.37E-01
2.46E-01
2.45E-01
2.39E-01
10
2.47E-01
2.42E-01
2.38E-01
2.47E-01
2.47E-01
2.43E-01
2.36E-01
2.37E-01
2.46E-01
2.46E-01
2.41E-01
20
2.47E-01
2.42E-01
2.39E-01
2.47E-01
2.47E-01
2.45E-01
2.37E-01
2.37E-01
2.47E-01
2.46E-01
2.41E-01
30
2.48E-01
2.43E-01
2.41E-01
2.48E-01
2.48E-01
2.45E-01
2.36E-01
2.37E-01
2.47E-01
2.47E-01
2.41E-01
50
2.51E-01
2.46E-01
2.43E-01
2.51E-01
2.51E-01
2.46E-01
2.37E-01
2.38E-01
2.48E-01
2.48E-01
2.38E-01
60
2.52E-01
2.46E-01
2.43E-01
2.52E-01
2.52E-01
2.46E-01
2.37E-01
2.38E-01
2.48E-01
2.48E-01
2.38E-01
70
2.54E-01
2.49E-01
2.47E-01
2.54E-01
2.54E-01
2.48E-01
2.39E-01
2.41E-01
2.50E-01
2.49E-01
2.40E-01
2.42E-01
3.58E-03
2.58E-01
2.25E-01
2.44E-01
4.09E-03
2.63E-01
2.25E-01
2.44E-01
3.71E-03
2.62E-01
2.27E-01
2.46E-01
3.36E-03
2.61E-01
2.30E-01
2.48E-01
3.71E-03
2.66E-01
2.31E-01
2.49E-01
4.24E-03
2.69E-01
2.29E-01
2.52E-01
3.36E-03
2.67E-01
2.36E-01
2.41E-01
4.62E-03
2.63E-01
2.20E-01
3.50E-01
PASS
2.42E-01
4.83E-03
2.64E-01
2.19E-01
6.00E-01
PASS
2.42E-01
4.98E-03
2.66E-01
2.19E-01
8.00E-01
PASS
2.42E-01
5.46E-03
2.68E-01
2.17E-01
8.00E-01
PASS
2.43E-01
5.46E-03
2.69E-01
2.18E-01
1.00E+00
PASS
2.43E-01
5.46E-03
2.69E-01
2.18E-01
1.00E+00
PASS
2.45E-01
5.03E-03
2.69E-01
2.22E-01
1.00E+00
PASS
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Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Negative Output Voltage 12 IL=1mA @ +5V (V)
Specification MAX
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.84. Plot of Negative Output Voltage 12 IL=1mA @ +5V (V) versus total dose. The data show no
significant degradation with radiation. The solid diamonds are the average of measured data points from the
biased sample (devices irradiated with an electrical bias) while the shaded diamonds are the average from the
unbiased sample. The black lines show the effects on the data after application of the biased KTL statistics
(solid and dashed lines) while the gray lines show the effects on the data after application of the unbiased KTL
statistics (solid and dashed lines). The red dashed lines are the minimum and maximum specification values as
defined in the datasheet and/or test plan.
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Table 5.84. Raw data for Negative Output Voltage 12 IL=1mA @ +5V (V) versus total dose,
including the statistical analysis, the specification and the status of the testing (pass/fail).
Negative Output Voltage 12 IL=1mA @ +5V (V)
Device
1027
1029
1030
1031
1032
1033
1034
1035
1036
1038
1039
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.39E-01
2.36E-01
2.39E-01
2.38E-01
2.38E-01
2.41E-01
2.40E-01
2.40E-01
2.38E-01
2.39E-01
2.35E-01
10
2.41E-01
2.38E-01
2.42E-01
2.41E-01
2.42E-01
2.42E-01
2.41E-01
2.41E-01
2.38E-01
2.40E-01
2.38E-01
20
2.42E-01
2.39E-01
2.41E-01
2.41E-01
2.42E-01
2.42E-01
2.42E-01
2.41E-01
2.38E-01
2.40E-01
2.38E-01
30
2.43E-01
2.39E-01
2.43E-01
2.42E-01
2.42E-01
2.42E-01
2.42E-01
2.42E-01
2.39E-01
2.41E-01
2.37E-01
50
2.45E-01
2.42E-01
2.46E-01
2.44E-01
2.45E-01
2.43E-01
2.43E-01
2.42E-01
2.40E-01
2.41E-01
2.35E-01
60
2.46E-01
2.43E-01
2.46E-01
2.45E-01
2.45E-01
2.44E-01
2.43E-01
2.43E-01
2.40E-01
2.41E-01
2.36E-01
70
2.47E-01
2.46E-01
2.48E-01
2.47E-01
2.48E-01
2.45E-01
2.45E-01
2.44E-01
2.42E-01
2.43E-01
2.37E-01
2.38E-01
1.22E-03
2.44E-01
2.32E-01
2.41E-01
1.64E-03
2.48E-01
2.33E-01
2.41E-01
1.22E-03
2.47E-01
2.35E-01
2.42E-01
1.64E-03
2.49E-01
2.34E-01
2.44E-01
1.52E-03
2.51E-01
2.37E-01
2.45E-01
1.22E-03
2.51E-01
2.39E-01
2.47E-01
8.37E-04
2.51E-01
2.43E-01
2.40E-01
1.14E-03
2.45E-01
2.34E-01
3.50E-01
PASS
2.40E-01
1.52E-03
2.47E-01
2.33E-01
6.00E-01
PASS
2.41E-01
1.67E-03
2.48E-01
2.33E-01
8.00E-01
PASS
2.41E-01
1.30E-03
2.47E-01
2.35E-01
8.00E-01
PASS
2.42E-01
1.30E-03
2.48E-01
2.36E-01
1.00E+00
PASS
2.42E-01
1.64E-03
2.50E-01
2.35E-01
1.00E+00
PASS
2.44E-01
1.30E-03
2.50E-01
2.38E-01
1.00E+00
PASS
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6.0. Summary / Conclusions
The low dose rate total ionizing dose testing described in this final report was performed using the
facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. For the low
dose rate ELDRS testing described in this report, the devices were placed approximately 2-meters from
the Co-60 rods to achieve the required 10mrad(Si)/s dose rate. Samples of the RH1014MW quad
operational amplifier described in this report were irradiated biased with a split 15V supply and
unbiased (all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level
of 50krad(Si) with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si).
Electrical testing occurred within one hour following the end of each irradiation segment. For
intermediate irradiations, the units were tested and returned to total dose exposure within two hours from
the end of the previous radiation increment. In addition, all units-under-test received a 24hr room
temperature and168hr 100°C anneal, using the same bias conditions as the radiation exposure.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
were presented in this report. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to
determine the outcome of the testing: following the radiation exposure each parameter had to pass the
specification value and the average value for the ten-piece sample must pass the specification value
when the KTL limits are applied. If these conditions were not both satisfied following the radiation
exposure, then the lot would be logged as an RLAT failure.
Based on these criteria, the RH1014MW quad operational amplifier discussed in this report passed the
ELDRS test to the highest level tested of 50krad(Si) without any appreciable degradation to most of the
measured parameters. Where radiation induced degradation was observed the degradation was not
sufficient to cause the parameter to exceed the specification value.
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Appendix A: TID Bias Connections
(Extracted from LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational
Amplifier Datasheet)
Biased Samples:
Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Function
OUT A
-IN A
+IN A
V+
+IN B
-IN B
OUT B
OUT C
-IN C
+IN C
V+IN D
-IN D
OUT D
Bias
To Pin 2 Via 10kΩ Resistor
To Pin 1 Via 10kΩ Resistor
8V Via 10kΩ Resistor
+15V Decoupled to GND W/ 0.1μF
8V Via 10kΩ Resistor
To Pin 7 Via 10kΩ Resistor
To Pin 6 Via 10kΩ Resistor
To Pin 9 Via 10kΩ Resistor
To Pin 8 Via 10kΩ Resistor
8V Via 10kΩ Resistor
-15V Decoupled to GND W/ 0.1μF
8V Via 10kΩ Resistor
To Pin 14 Via 10kΩ Resistor
To Pin 13 Via 10kΩ Resistor
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Unbiased Samples (All Pins Tied to Ground):
Pin
1
2
3
4
5
6
7
8
9
10
11
12
13
14
Function
OUT A
-IN A
+IN A
V+
+IN B
-IN B
OUT B
OUT C
-IN C
+IN C
V+IN D
-IN D
OUT D
Bias
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
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Figure A.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from the LINEAR TECHNOLOGY CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet.
Figure A.2. Package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY
CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet.
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Appendix B: Photograph of device-under-test to show part markings
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on Radiation Assured Device’s LTS2020 Test System.
The LTS2020 Test System is a programmable parametric tester that provides parameter measurements
for a variety of digital, analog and mixed signal products including voltage regulators, voltage
comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The measured parameters and test conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain,
where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes
could be used to qualify these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1014MW. Unless otherwise noted the
conditions were selected to match the post-irradiation specifications. See LINEAR TECHNOLOGY
CORPORATION RH1014M Quad Precision Operational Amplifier Datasheet for the post irradiation test
conditions and specifications.
TEST
NUMBER
TEST
DESCRIPTION
TEST
CONDITIONS
1
Positive Supply Current (ICC+)
VS=±15V
2
Negative Supply Current (IEE-)
VS=±15V
3
Input Offset Voltage (VOS1-VOS4)
VS=±15V
4
Input Offset Current (IOS1-IOS4)
VS=±15V
5
+ Input Bias Current (IB+1-IB+4)
VS=±15V
6
- Input Bias Current (IB-1-IB-4)
VS=±15V
7
Common Mode Rejection Ratio (CMRR1-CMRR4) VCM = 13.5V, –15V
8
Power Supply Rejection Ratio (PSRR1-PSRR4)
VS = ±2V to ±18V
9
Large Signal Voltage Gain (AVOL9-AVOL12)
VS=±15V, VO = ±10V, RL = 10kΩ
10
Positive Output Voltage Swing (VOUT+1-VOUT+4)
VS=±15V, RL= 2kΩ
11
Negative Output Voltage Swing (VOUT-1-VOUT-4)
VS=±15V, RL= 2kΩ
12
Positive Slew Rate (SlewRate+1-SlewRate+4)
VS=±15V, RL= 10kΩ
13
Negative Slew Rate (SlewRate-1-SlewRate-4)
VS=±15V, RL= 10kΩ
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ELDRS Report
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14
Positive Supply Current (ICC+2)
VS=+5V, VOUT=1.4V Using Servo
Loop
15
Negative Supply Current (IEE-2)
VS=+5V, VOUT=1.4V Using Servo
Loop
16
Input Offset Voltage (VOS5-VOS8)
VS=+5V
17
Input Offset Current (IOS5-IOS8)
VS=+5V
18
+ Input Bias Current (IB+5-IB+8)
VS=+5V
19
- Input Bias Current (IB-5-IB-8)
VS=+5V
20
Positive Output Voltage Swing (VOUT+5-VOUT+8)
VS=+5V, No Load
21
Positive Output Voltage Swing (VOUT+9-VOUT+12)
VS=+5V, RL= 600Ω
22
Negative Output Voltage Swing (VOUT-5-VOUT-8)
VS=+5V, No Load
23
Negative Output Voltage Swing (VOUT-9-VOUT-12)
VS=+5V, RL= 600Ω
24
Negative Output Voltage Swing (VOUT-13-VOUT-16)
VS=+5V, ISINK= 1mA
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Radiation Assured Devices
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ELDRS Report
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Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution for the
RH1014MW.
Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current (ICC+)
2.2mA
±4.8E-06A
Negative Supply Current (IEE-)
-2.2mA
±3.6E-06A
Input Offset Voltage (VOS1-VOS4)
±0.3mV
± 1.27E-06V
Input Offset Current (IOS1-IOS4)
±10nA
± 2.64E-11A
+ Input Bias Current (IB+1-IB+4)
±30nA
±5.02E-11A
- Input Bias Current (IB-1-IB-4)
±30nA
± 3.95E-11A
Common Mode Rejection Ratio (CMRR1CMRR4)
97dB
±1.89dB
Power Supply Rejection Ratio (PSRR1-PSRR4)
100dB
±3.35dB
1200V/mV
±1.70E+04V/mV
Positive Output Voltage Swing (VOUT+1-VOUT+4)
12.5V
±1.46E-03V
Negative Output Voltage Swing (VOUT-1-VOUT-4)
-12.5V
±1.63E-03V
Positive Slew Rate (SlewRate+1-SlewRate+4)
0.2V/μs
±1.9E-02V/μs
Negative Slew Rate (SlewRate-1-SlewRate-4)
-0.2V/μs
±2.49E-02V/μs
Measured Parameter
Large Signal Voltage Gain (AVOL9-AVOL12)
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Radiation Assured Devices
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Positive Supply Current (ICC+2)
2.0mA
±4.8E-06A
Negative Supply Current (IEE-2)
-2.0mA
±3.6E-06A
±0.45mV
± 1.4E-06V
Input Offset Current (IOS5-IOS8)
±10nA
± 3.2E-11A
+ Input Bias Current (IB+5-IB+8)
±50nA
±9.7E-11A
- Input Bias Current (IB-5-IB-8)
±50nA
± 5.6E-11A
4.0V
±1.5E-03V
3.4V
±1.2E-03V
25mV
±1.2E-03V
10mV
±1.6E-03V
350mV
±1.5E-03V
Input Offset Voltage (VOS5-VOS8)
Positive Output Voltage Swing (VOUT+5VOUT+8)
Positive Output Voltage Swing (VOUT+9VOUT+12)
Negative Output Voltage Swing (VOUT-5-VOUT8)
Negative Output Voltage Swing (VOUT-9-VOUT12)
Negative Output Voltage Swing (VOUT-13VOUT-16)
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Appendix D: List of Figures
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
Positive Supply Current @ +/-15V (A)
Negative Supply Current @ +/-15V (A)
Offset Voltage 1 @ +/-15V (V)
Offset Voltage 2 @ +/-15V (V)
Offset Voltage 3 @ +/-15V (V)
Offset Voltage 4 @ +/-15V (V)
Offset Current 1 @ +/-15V (A)
Offset Current 2 @ +/-15V (A)
Offset Current 3 @ +/-15V (A)
Offset Current 4 @ +/-15V (A)
Positive Bias Current 1 @ +/-15V (A)
Positive Bias Current 2 @ +/-15V (A)
Positive Bias Current 3 @ +/-15V (A)
Positive Bias Current 4 @ +/-15V (A)
Negative Bias Current 1 @ +/-15V (A)
Negative Bias Current 2 @ +/-15V (A)
Negative Bias Current 3 @ +/-15V (A)
Negative Bias Current 4 @ +/-15V (A)
Common Mode Rejection Ratio 1 (dB)
Common Mode Rejection Ratio 2 (dB)
Common Mode Rejection Ratio 3 (dB)
Common Mode Rejection Ratio 4 (dB)
Power Supply Rejection Ratio 1 (dB)
Power Supply Rejection Ratio 2 (dB)
Power Supply Rejection Ratio 3 (dB)
Power Supply Rejection Ratio 4 (dB)
Open Loop Gain 9 RL=10k VO=+/-10V (V/mV)
Open Loop Gain 10 RL=10k VO=+/-10V (V/mV)
Open Loop Gain 11 RL=10k VO=+/-10V (V/mV)
Open Loop Gain 12 RL=10k VO=+/-10V (V/mV)
Positive Output Voltage 1 @ +/-15V (V)
Positive Output Voltage 2 @ +/-15V (V)
Positive Output Voltage 3 @ +/-15V (V)
Positive Output Voltage 4 @ +/-15V (V)
Negative Output Voltage 1 @ +/-15V (V)
Negative Output Voltage 2 @ +/-15V (V)
Negative Output Voltage 3 @ +/-15V (V)
Negative Output Voltage 4 @ +/-15V (V)
Positive Slew Rate 1 @ +/-15V (V/us)
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ELDRS Report
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5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
5.63
5.64
5.65
5.66
5.67
5.68
5.69
5.70
5.71
5.72
5.73
5.74
5.75
5.76
5.77
5.78
5.79
5.80
Positive Slew Rate 2 @ +/-15V (V/us)
Positive Slew Rate 3 @ +/-15V (V/us)
Positive Slew Rate 4 @ +/-15V (V/us)
Negative Slew Rate 1 @ +/-15V (V/us)
Negative Slew Rate 2 @ +/-15V (V/us)
Negative Slew Rate 3 @ +/-15V (V/us)
Negative Slew Rate 4 @ +/-15V (V/us)
Positive Supply Current @ +5V (A)
Negative Supply Current @ +5V (A)
Offset Voltage 1 @ +5V (V)
Offset Voltage 2 @ +5V (V)
Offset Voltage 3 @ +5V (V)
Offset Voltage 4 @ +5V (V)
Offset Current 1 @ +5V (A)
Offset Current 2 @ +5V (A)
Offset Current 3 @ +5V (A)
Offset Current 4 @ +5V (A)
Positive Bias Current 1 @ +5V (A)
Positive Bias Current 2 @ +5V (A)
Positive Bias Current 3 @ +5V (A)
Positive Bias Current 4 @ +5V (A)
Negative Bias Current 1 @ +5V (A)
Negative Bias Current 2 @ +5V (A)
Negative Bias Current 3 @ +5V (A)
Negative Bias Current 4 @ +5V (A)
Positive Output Voltage 1 RL=open @ +5V (V)
Positive Output Voltage 2 RL=open @ +5V (V)
Positive Output Voltage 3 RL=open @ +5V (V)
Positive Output Voltage 4 RL=open @ +5V (V)
Positive Output Voltage 5 RL=600 @ +5V (V)
Positive Output Voltage 6 RL=600 @ +5V (V)
Positive Output Voltage 7 RL=600 @ +5V (V)
Positive Output Voltage 8 RL=600 @ +5V (V)
Negative Output Voltage 1 RL=open @ +5V (V)
Negative Output Voltage 2 RL=open @ +5V (V)
Negative Output Voltage 3 RL=open @ +5V (V)
Negative Output Voltage 4 RL=open @ +5V (V)
Negative Output Voltage 5 RL=600 @ +5V (V)
Negative Output Voltage 6 RL=600 @ +5V (V)
Negative Output Voltage 7 RL=600 @ +5V (V)
Negative Output Voltage 8 RL=600 @ +5V (V)
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ELDRS Report
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5.81
5.82
5.83
5.84
Negative Output Voltage 9 IL=1mA @ +5V (V)
Negative Output Voltage 10 IL=1mA @ +5V (V)
Negative Output Voltage 11 IL=1mA @ +5V (V)
Negative Output Voltage 12 IL=1mA @ +5V (V)
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