ELDRS Report_RH1078MJ8_Fab Lot W0933494.1.pdf

ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) of the RH1078MJ8 Dual
Precision Op Amp for Linear Technology
Customer: Linear Technology, PO# 54873L
RAD Job Number: 09-578
Part Type Tested: Linear Technology RH1078MJ8 Dual Precision Operational Amplifier
Commercial Part Number: RH1078MJ8
Traceability Information: Lot Date Code: 0939A, Assy Lot# 540915.1, Fab Lot# W0933494.1, Wafer 12
(Obtained from Linear Technology PO 54873L). See photograph of unit under test in Appendix A.
Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 control
units. Serial numbers 4, 51, 54, 104, and 105 were biased during irradiation, serial numbers 152, 155, 156, 202,
and 205 were unbiased during irradiation and serial numbers 530 and 561 were used as controls. See Appendix B
for the radiation bias connection table.
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware and Software: LTS2020 Tester, 2101 Family Board, 0600 Fixture, RH1078 DUT Board, and
RH1078LT.SRC test program.
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5.
Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C±6°C per MILSTD-883.
Low Dose Rate Test Result: PASSED. Units passed to the maximum tested
total dose of 50krad(Si) with no significant degradation observed to any
measured parameter. Further, the units do not exhibit ELDRS as defined in the
current test method.
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ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
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(719) 531-0800
Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the
device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from
approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4meters.
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ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH1078MJ8 Dual Precision Op Amp described in this final report was irradiated using a split 15V
supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix
A for the full bias circuits. In our opinion these bias circuits satisfy the requirements of MIL-STD-883G
TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices
shall be selected to produce the greatest radiation induced damage or the worst-case damage for the
intended application, if known. While maximum voltage is often worst case some bipolar linear device
parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V
bias.”
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of
each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose
exposure within two hours from the end of the previous radiation increment. The ELDRS bias board
was positioned in the Co-60 cell to provide the required maximum of 10mrad(Si)/s and was located
inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G
TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall
be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered
radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required.
This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as
CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when
the source is changed, or (3) when the orientation or configuration of the source, container, or testfixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the
device-irradiation container at the approximate test-device position. If it can be demonstrated that low
energy scattered radiation is small enough that it will not cause dosimetry errors due to dose
enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10mrad(Si)/s with a precision of ±5%.
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ELDRS Report
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Radiation Assured Devices
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4.0. Tested Parameters
During the ELDRS testing the following electrical parameters were measured pre- and post-irradiation:
±15V Tests
1. Positive Supply Current (ICC2)
2. Negative Supply Current (IEE2)
3. Input Offset Voltage (VOS3 &VOS4)
4. Input Offset Current (IOS3 & IOS4)
5. + Input Bias Current (IB+3 & IB+4)
6. - Input Bias Current (IB-3 & IB-4)
7. Common Mode Rejection Ratio (CMRR3 & CMRR4)
8. Power Supply Rejection Ratio (PSRR3 & PSRR4)
9. Large Signal Voltage Gain (AVOL 5 &AVOL6)
10. Large Signal Voltage Gain (AVOL 7 &AVOL8)
11. VOUT High (VOUTHIGH5 & VOUTHIGH6)
12. VOUT High (VOUTHIGH7 & VOUTHIGH8)
13. VOUT Low (VOUTLOW7 & VOUTLOW8)
14. VOUT Low (VOUTLOW9 & VOUTLOW10)
15. +SR (Slew Rate 5 and Slew Rate 6)
16. -SR (Slew Rate 7 and Slew Rate 8)
+5V Tests
17. Positive Supply Current (ICC2)
18. Negative Supply Current (IEE2)
19. Input Offset Voltage (VOS1 &VOS2)
20. Input Offset Current (IOS1 & IOS2)
21. + Input Bias Current (IB+1 & IB+2)
22. - Input Bias Current (IB-1 & IB-2)
23. Common Mode Rejection Ratio (CMRR1 & CMRR2)
24. Power Supply Rejection Ratio (PSRR1 & PSRR2)
25. Large Signal Voltage Gain (AVOL 1 &AVOL2)
26. Large Signal Voltage Gain (AVOL3 &AVOL4)
27. VOUT Low (VOUTLOW1 & VOUTLOW2)
28. VOUT Low (VOUTLOW3 & VOUTLOW4)
29. VOUT Low (VOUTLOW5 & VOUTLOW6)
30. VOUT High (VOUTHIGH1 & VOUTHIGH2)
31. VOUT High (VOUTHIGH3 & VOUTHIGH4)
32. +SR (Slew Rate 1 and Slew Rate 2)
33. -SR (Slew Rate 3 and Slew Rate 4)
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ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
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Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used is 2.742 per MIL
HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated
under electrical bias shall pass the specification value. The units irradiated without electrical bias and
the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under
electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the low dose rate report titled “Total
Ionizing Dose (TID) Testing of the RH1078MJ8 Dual Precision Op Amp for Linear Technology” to
demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
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ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. ELDRS Test Results
Using the conditions stated above, the RH1078MJ8 Dual Precision Op Amp (from the lot date code
identified on the first page of this test report) passed the low dose rate test to the maximum tested level
of 50krad(Si) with no significant degradation observed on any measured parameter. Note that the data
presented in this report for the units-under-test irradiated in the unbiased condition and the KTL
statistics are for reference only and are not used for the determination of “PASS/FAIL” for the lot.
Figures 5.1 through 5.62 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 – 5.62 show the corresponding raw data for each of these parameters. In these data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the total dose test. In all cases the parts either improved or exhibited no change during
the anneal.
As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even
after application of the KTL statistics and the control units, as expected, show no significant changes to
any of the parameters throughout the course of the measurements. Therefore we can conclude that any
observed degradation was due to the radiation exposure and not drift in the test equipment.
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ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Supply Current @ +5V (A)
1.70E-04
1.50E-04
1.30E-04
1.10E-04
9.00E-05
7.00E-05
5.00E-05
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.1. Plot of Positive Supply Current @ +5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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ELDRS Report
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Table 5.1. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.17E-04
1.11E-04
1.09E-04
1.06E-04
1.09E-04
1.09E-04
1.12E-04
1.05E-04
1.05E-04
1.07E-04
1.11E-04
1.10E-04
10
1.12E-04
1.05E-04
1.05E-04
1.03E-04
1.04E-04
1.05E-04
1.11E-04
1.02E-04
1.02E-04
1.05E-04
1.12E-04
1.10E-04
20
1.12E-04
1.01E-04
1.01E-04
1.00E-04
1.01E-04
1.01E-04
1.06E-04
9.60E-05
9.80E-05
1.01E-04
1.15E-04
1.14E-04
30
1.06E-04
9.60E-05
9.70E-05
9.40E-05
9.70E-05
9.80E-05
1.05E-04
9.40E-05
9.80E-05
9.90E-05
1.14E-04
1.11E-04
50
9.90E-05
8.80E-05
8.80E-05
8.50E-05
8.80E-05
9.10E-05
9.60E-05
8.80E-05
8.90E-05
9.20E-05
1.15E-04
1.12E-04
60
9.50E-05
9.00E-05
8.50E-05
8.60E-05
8.90E-05
9.10E-05
1.00E-04
8.80E-05
8.90E-05
9.10E-05
1.12E-04
1.17E-04
70
1.01E-04
9.10E-05
9.10E-05
8.70E-05
9.00E-05
9.60E-05
1.02E-04
9.30E-05
9.30E-05
9.70E-05
1.13E-04
1.12E-04
1.10E-04
4.10E-06
1.22E-04
9.92E-05
1.06E-04
3.56E-06
1.16E-04
9.60E-05
1.03E-04
5.05E-06
1.17E-04
8.92E-05
9.80E-05
4.64E-06
1.11E-04
8.53E-05
8.96E-05
5.41E-06
1.04E-04
7.48E-05
8.90E-05
3.94E-06
9.98E-05
7.82E-05
9.20E-05
5.29E-06
1.07E-04
7.75E-05
1.08E-04
2.97E-06
1.16E-04
9.95E-05
1.50E-04
PASS
1.05E-04
3.67E-06
1.15E-04
9.49E-05
1.50E-04
PASS
1.00E-04
3.78E-06
1.11E-04
9.00E-05
1.50E-04
PASS
9.88E-05
3.96E-06
1.10E-04
8.79E-05
1.50E-04
PASS
9.12E-05
3.11E-06
9.97E-05
8.27E-05
1.50E-04
PASS
9.18E-05
4.76E-06
1.05E-04
7.87E-05
1.50E-04
PASS
9.62E-05
3.70E-06
1.06E-04
8.61E-05
1.50E-04
PASS
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ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @ +5V (A)
-5.00E-05
-7.00E-05
-9.00E-05
-1.10E-04
-1.30E-04
-1.50E-04
-1.70E-04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current @ +5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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ELDRS Report
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Table 5.2. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
-1.14E-04
-1.06E-04
-1.05E-04
-1.03E-04
-1.06E-04
-1.06E-04
-1.10E-04
-1.02E-04
-1.03E-04
-1.06E-04
-1.11E-04
-1.09E-04
10
-1.12E-04
-1.03E-04
-1.02E-04
-1.00E-04
-1.02E-04
-1.02E-04
-1.08E-04
-9.80E-05
-1.00E-04
-1.02E-04
-1.11E-04
-1.09E-04
20
-1.07E-04
-9.80E-05
-9.90E-05
-9.60E-05
-9.80E-05
-9.80E-05
-1.04E-04
-9.40E-05
-9.50E-05
-9.90E-05
-1.10E-04
-1.09E-04
30
-1.03E-04
-9.50E-05
-9.60E-05
-9.20E-05
-9.40E-05
-9.50E-05
-1.01E-04
-9.20E-05
-9.30E-05
-9.60E-05
-1.10E-04
-1.08E-04
50
-9.40E-05
-8.50E-05
-8.50E-05
-8.30E-05
-8.50E-05
-8.80E-05
-9.40E-05
-8.50E-05
-8.50E-05
-8.80E-05
-1.10E-04
-1.09E-04
60
-9.60E-05
-8.60E-05
-8.60E-05
-8.30E-05
-8.60E-05
-8.90E-05
-9.40E-05
-8.50E-05
-8.50E-05
-8.90E-05
-1.12E-04
-1.10E-04
70
-9.80E-05
-8.80E-05
-8.70E-05
-8.60E-05
-8.80E-05
-9.40E-05
-1.00E-04
-9.10E-05
-9.00E-05
-9.30E-05
-1.10E-04
-1.09E-04
-1.07E-04
4.21E-06
-9.53E-05
-1.18E-04
-1.04E-04
4.71E-06
-9.09E-05
-1.17E-04
-9.96E-05
4.28E-06
-8.79E-05
-1.11E-04
-9.60E-05
4.18E-06
-8.45E-05
-1.07E-04
-8.64E-05
4.34E-06
-7.45E-05
-9.83E-05
-8.74E-05
4.98E-06
-7.37E-05
-1.01E-04
-8.94E-05
4.88E-06
-7.60E-05
-1.03E-04
-1.05E-04
3.13E-06
-9.68E-05
-1.14E-04
-1.50E-04
PASS
-1.02E-04
3.74E-06
-9.17E-05
-1.12E-04
-1.50E-04
PASS
-9.80E-05
3.94E-06
-8.72E-05
-1.09E-04
-1.50E-04
PASS
-9.54E-05
3.51E-06
-8.58E-05
-1.05E-04
-1.50E-04
PASS
-8.80E-05
3.67E-06
-7.79E-05
-9.81E-05
-1.50E-04
PASS
-8.84E-05
3.71E-06
-7.82E-05
-9.86E-05
-1.50E-04
PASS
-9.36E-05
3.91E-06
-8.29E-05
-1.04E-04
-1.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
11
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 1 @ +5V (V)
3.00E-04
2.00E-04
1.00E-04
0.00E+00
-1.00E-04
-2.00E-04
-3.00E-04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage 1 @ +5V (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
12
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.3. Raw data for Input Offset Voltage 1 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 @ +5V (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.13E-05
-5.82E-05
-2.97E-05
7.18E-05
2.18E-05
9.52E-07
5.19E-05
2.69E-05
5.33E-05
8.30E-05
1.30E-05
2.61E-05
10
3.68E-05
-6.05E-05
-3.39E-05
7.09E-05
1.34E-05
-8.43E-07
3.92E-05
2.04E-05
5.12E-05
7.46E-05
1.04E-05
2.72E-05
20
4.18E-05
-5.82E-05
-2.69E-05
7.53E-05
1.75E-05
3.86E-06
4.15E-05
1.67E-05
5.50E-05
7.84E-05
1.69E-05
2.41E-05
30
4.55E-05
-4.31E-05
-1.82E-05
8.94E-05
2.92E-05
2.65E-06
4.24E-05
1.50E-05
6.05E-05
7.60E-05
1.47E-05
3.16E-05
50
5.20E-05
-2.13E-05
7.83E-06
1.13E-04
5.04E-05
1.27E-05
4.05E-05
1.53E-05
6.53E-05
7.78E-05
1.37E-05
2.88E-05
60
5.01E-05
-2.48E-05
6.14E-06
1.14E-04
4.93E-05
1.19E-05
4.33E-05
2.01E-05
7.18E-05
8.75E-05
1.42E-05
3.02E-05
70
3.97E-06
-7.85E-05
-5.22E-05
4.14E-05
-6.53E-06
-4.36E-06
3.71E-05
2.65E-06
4.31E-05
6.58E-05
1.01E-05
2.52E-05
9.40E-06
5.28E-05
1.54E-04
-1.35E-04
5.34E-06
5.30E-05
1.51E-04
-1.40E-04
9.90E-06
5.33E-05
1.56E-04
-1.36E-04
2.06E-05
5.24E-05
1.64E-04
-1.23E-04
4.03E-05
5.08E-05
1.80E-04
-9.90E-05
3.90E-05
5.26E-05
1.83E-04
-1.05E-04
-1.84E-05
4.73E-05
1.11E-04
-1.48E-04
4.32E-05
3.09E-05
1.28E-04
-4.15E-05
-1.20E-04
PASS
1.20E-04
PASS
3.69E-05
2.88E-05
1.16E-04
-4.22E-05
-1.20E-04
PASS
1.20E-04
PASS
3.91E-05
2.98E-05
1.21E-04
-4.26E-05
-1.20E-04
PASS
1.20E-04
PASS
3.93E-05
3.06E-05
1.23E-04
-4.46E-05
-1.75E-04
PASS
1.75E-04
PASS
4.23E-05
2.92E-05
1.22E-04
-3.76E-05
-2.50E-04
PASS
2.50E-04
PASS
4.69E-05
3.25E-05
1.36E-04
-4.21E-05
-2.50E-04
PASS
2.50E-04
PASS
2.88E-05
2.93E-05
1.09E-04
-5.14E-05
-2.50E-04
PASS
2.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 2 @ +5V (V)
3.00E-04
2.00E-04
1.00E-04
0.00E+00
-1.00E-04
-2.00E-04
-3.00E-04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Voltage 2 @ +5V (V) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.4. Raw data for Input Offset Voltage 2 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 2 @ +5V (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.25E-05
4.45E-06
5.48E-05
3.31E-05
5.55E-05
3.38E-05
7.35E-05
6.64E-05
-4.91E-05
4.56E-05
-4.47E-05
6.77E-05
10
8.69E-05
-1.19E-07
4.82E-05
2.37E-05
5.05E-05
2.67E-05
6.74E-05
6.37E-05
-5.64E-05
4.31E-05
-4.47E-05
6.88E-05
20
9.15E-05
8.81E-06
5.47E-05
3.28E-05
5.67E-05
3.15E-05
6.86E-05
6.34E-05
-5.87E-05
4.18E-05
-4.00E-05
6.37E-05
30
9.97E-05
1.76E-05
6.79E-05
3.92E-05
6.84E-05
3.48E-05
6.92E-05
6.86E-05
-5.06E-05
4.38E-05
-3.90E-05
6.96E-05
50
1.19E-04
4.03E-05
9.35E-05
5.95E-05
8.82E-05
4.28E-05
6.67E-05
7.52E-05
-3.96E-05
5.24E-05
-4.19E-05
6.99E-05
60
1.14E-04
3.39E-05
9.05E-05
5.78E-05
8.85E-05
4.58E-05
7.61E-05
7.46E-05
-3.45E-05
5.47E-05
-4.44E-05
6.85E-05
70
5.84E-05
-3.25E-05
2.49E-05
-3.71E-07
2.78E-05
3.14E-05
6.38E-05
5.83E-05
-6.80E-05
3.05E-05
-4.64E-05
6.76E-05
4.81E-05
3.24E-05
1.37E-04
-4.08E-05
4.18E-05
3.25E-05
1.31E-04
-4.74E-05
4.89E-05
3.07E-05
1.33E-04
-3.53E-05
5.86E-05
3.13E-05
1.45E-04
-2.73E-05
8.00E-05
3.05E-05
1.64E-04
-3.73E-06
7.69E-05
3.12E-05
1.62E-04
-8.59E-06
1.56E-05
3.40E-05
1.09E-04
-7.77E-05
3.40E-05
4.91E-05
1.69E-04
-1.01E-04
-1.20E-04
PASS
1.20E-04
PASS
2.89E-05
5.04E-05
1.67E-04
-1.09E-04
-1.20E-04
PASS
1.20E-04
PASS
2.93E-05
5.15E-05
1.70E-04
-1.12E-04
-1.20E-04
PASS
1.20E-04
PASS
3.31E-05
4.92E-05
1.68E-04
-1.02E-04
-1.75E-04
PASS
1.75E-04
PASS
3.95E-05
4.60E-05
1.66E-04
-8.65E-05
-2.50E-04
PASS
2.50E-04
PASS
4.33E-05
4.54E-05
1.68E-04
-8.12E-05
-2.50E-04
PASS
2.50E-04
PASS
2.32E-05
5.32E-05
1.69E-04
-1.23E-04
-2.50E-04
PASS
2.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 1 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.5. Plot of Input Offset Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.5. Raw data for Input Offset Current 1 @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 1 @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-7.00E-11
-7.00E-11
-1.10E-10
0.00E+00
4.00E-11
-1.20E-10
-9.00E-11
0.00E+00
-1.20E-10
-5.00E-11
-8.00E-11
-4.00E-11
10
-6.00E-11
1.00E-11
-1.10E-10
6.00E-11
-4.00E-11
-2.00E-11
-1.10E-10
-1.40E-10
-1.60E-10
-7.00E-11
-1.90E-10
-3.00E-11
20
-1.00E-10
1.10E-10
-2.00E-10
-1.00E-10
-1.00E-10
0.00E+00
-3.00E-11
-9.00E-11
-3.00E-11
-7.00E-11
-1.90E-10
-4.00E-11
30
-5.00E-11
0.00E+00
-3.00E-10
-8.00E-11
-2.10E-10
-4.00E-11
-6.00E-11
-4.00E-11
-1.20E-10
-2.00E-11
-1.60E-10
-1.00E-11
50
-9.00E-11
-1.30E-10
-2.30E-10
6.00E-11
-1.80E-10
-1.00E-11
1.50E-10
8.00E-11
-3.30E-10
4.00E-11
-9.00E-11
-6.00E-11
60
-1.10E-10
-2.00E-11
-1.40E-10
-8.00E-11
-1.10E-10
0.00E+00
1.80E-10
0.00E+00
-3.20E-10
2.00E-11
-1.80E-10
-5.00E-11
70
-4.44E-09
-4.50E-09
-4.71E-09
-4.66E-09
-4.71E-09
-5.00E-11
5.00E-11
-1.00E-11
-9.00E-11
-4.00E-11
0.00E+00
-2.00E-11
-4.20E-11
6.06E-11
1.24E-10
-2.08E-10
-2.80E-11
6.53E-11
1.51E-10
-2.07E-10
-7.80E-11
1.14E-10
2.34E-10
-3.90E-10
-1.28E-10
1.24E-10
2.11E-10
-4.67E-10
-1.14E-10
1.11E-10
1.89E-10
-4.17E-10
-9.20E-11
4.55E-11
3.28E-11
-2.17E-10
-4.60E-09
1.26E-10
-4.26E-09
-4.95E-09
-7.60E-11
5.13E-11
6.46E-11
-2.17E-10
-8.00E-10
PASS
8.00E-10
PASS
-1.00E-10
5.61E-11
5.39E-11
-2.54E-10
-2.00E-09
PASS
2.00E-09
PASS
-4.40E-11
3.58E-11
5.41E-11
-1.42E-10
-2.00E-09
PASS
2.00E-09
PASS
-5.60E-11
3.85E-11
4.95E-11
-1.61E-10
-8.00E-09
PASS
8.00E-09
PASS
-1.40E-11
1.86E-10
4.96E-10
-5.24E-10
-1.30E-08
PASS
1.30E-08
PASS
-2.40E-11
1.82E-10
4.75E-10
-5.23E-10
-1.30E-08
PASS
1.30E-08
PASS
-2.80E-11
5.22E-11
1.15E-10
-1.71E-10
-1.30E-08
PASS
1.30E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 2 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.6. Plot of Input Offset Current 2 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.6. Raw data for Input Offset Current 2 @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 2 @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.10E-10
-7.00E-11
-1.30E-10
-2.00E-11
-1.60E-10
5.00E-11
-2.10E-10
-1.00E-10
-3.00E-11
-9.00E-11
-5.00E-11
-2.20E-10
10
-2.00E-11
1.00E-10
-1.80E-10
0.00E+00
-1.00E-11
3.00E-11
-2.60E-10
-8.00E-11
0.00E+00
-3.00E-11
-5.00E-11
-9.00E-11
20
9.00E-11
3.00E-11
-2.80E-10
1.20E-10
-1.10E-10
9.00E-11
-3.00E-11
-1.00E-11
-9.00E-11
-2.00E-11
-3.00E-11
-1.60E-10
30
1.20E-10
6.00E-11
-1.00E-10
5.00E-11
-3.00E-11
2.50E-10
1.90E-10
1.20E-10
2.10E-10
5.00E-11
2.00E-11
-1.10E-10
50
3.00E-11
3.00E-11
-5.20E-10
-1.10E-10
-2.50E-10
2.00E-10
3.30E-10
1.50E-10
3.00E-10
1.80E-10
-1.00E-11
-1.30E-10
60
4.00E-11
1.30E-10
-4.70E-10
-7.00E-11
-2.80E-10
3.90E-10
6.70E-10
2.80E-10
4.40E-10
4.00E-10
2.00E-11
-1.30E-10
70
-4.30E-09
-4.71E-09
-4.98E-09
-4.37E-09
-4.70E-09
4.00E-11
-8.00E-11
0.00E+00
1.40E-10
-6.00E-11
-3.00E-11
-1.20E-10
-9.80E-11
5.45E-11
5.14E-11
-2.47E-10
-2.20E-11
1.01E-10
2.54E-10
-2.98E-10
-3.00E-11
1.65E-10
4.23E-10
-4.83E-10
2.00E-11
8.57E-11
2.55E-10
-2.15E-10
-1.64E-10
2.30E-10
4.68E-10
-7.96E-10
-1.30E-10
2.44E-10
5.39E-10
-7.99E-10
-4.61E-09
2.78E-10
-3.85E-09
-5.37E-09
-7.60E-11
9.58E-11
1.87E-10
-3.39E-10
-8.00E-10
PASS
8.00E-10
PASS
-6.80E-11
1.15E-10
2.47E-10
-3.83E-10
-2.00E-09
PASS
2.00E-09
PASS
-1.20E-11
6.50E-11
1.66E-10
-1.90E-10
-2.00E-09
PASS
2.00E-09
PASS
1.64E-10
7.92E-11
3.81E-10
-5.33E-11
-8.00E-09
PASS
8.00E-09
PASS
2.32E-10
7.85E-11
4.47E-10
1.66E-11
-1.30E-08
PASS
1.30E-08
PASS
4.36E-10
1.44E-10
8.30E-10
4.22E-11
-1.30E-08
PASS
1.30E-08
PASS
8.00E-12
8.79E-11
2.49E-10
-2.33E-10
-1.30E-08
PASS
1.30E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 1 @ +5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.7. Plot of Positive Input Bias Current 1 @ +5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.7. Raw data for Positive Input Bias Current 1 @ +5V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 1 @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.95E-09
9.63E-09
9.12E-09
9.35E-09
9.26E-09
9.10E-09
9.55E-09
9.54E-09
9.19E-09
9.51E-09
9.50E-09
9.32E-09
10
1.14E-08
1.21E-08
1.16E-08
1.19E-08
1.17E-08
1.11E-08
1.18E-08
1.15E-08
1.12E-08
1.16E-08
9.50E-09
9.27E-09
20
1.49E-08
1.59E-08
1.48E-08
1.52E-08
1.51E-08
1.34E-08
1.43E-08
1.41E-08
1.35E-08
1.39E-08
9.50E-09
9.25E-09
30
1.81E-08
1.92E-08
1.81E-08
1.84E-08
1.83E-08
1.55E-08
1.69E-08
1.63E-08
1.56E-08
1.62E-08
9.57E-09
9.16E-09
50
2.55E-08
2.67E-08
2.53E-08
2.54E-08
2.57E-08
2.03E-08
2.20E-08
2.12E-08
2.03E-08
2.11E-08
9.59E-09
9.33E-09
60
2.55E-08
2.68E-08
2.53E-08
2.55E-08
2.58E-08
2.01E-08
2.20E-08
2.11E-08
2.04E-08
2.11E-08
9.55E-09
9.39E-09
70
1.93E-08
2.09E-08
1.98E-08
1.99E-08
2.00E-08
1.81E-08
1.95E-08
1.89E-08
1.82E-08
1.90E-08
9.50E-09
9.41E-09
9.26E-09
2.55E-10
9.96E-09
8.56E-09
1.17E-08
2.80E-10
1.25E-08
1.10E-08
1.52E-08
4.25E-10
1.63E-08
1.40E-08
1.84E-08
4.55E-10
1.97E-08
1.72E-08
2.57E-08
5.53E-10
2.72E-08
2.42E-08
2.58E-08
5.70E-10
2.73E-08
2.42E-08
2.00E-08
5.75E-10
2.16E-08
1.84E-08
9.38E-09
2.16E-10
9.97E-09
8.79E-09
-1.50E-08
PASS
1.50E-08
PASS
1.14E-08
3.05E-10
1.23E-08
1.06E-08
-2.00E-08
PASS
2.00E-08
PASS
1.38E-08
4.05E-10
1.49E-08
1.27E-08
-2.00E-08
PASS
2.00E-08
PASS
1.61E-08
5.48E-10
1.76E-08
1.46E-08
-4.00E-08
PASS
4.00E-08
PASS
2.10E-08
6.94E-10
2.29E-08
1.91E-08
-8.00E-08
PASS
8.00E-08
PASS
2.09E-08
7.31E-10
2.29E-08
1.89E-08
-8.00E-08
PASS
8.00E-08
PASS
1.87E-08
5.71E-10
2.03E-08
1.72E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 2 @ +5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.8. Plot of Positive Input Bias Current 2 @ +5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.8. Raw data for Positive Input Bias Current 2 @ +5V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 2 @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.01E-09
9.80E-09
9.14E-09
9.54E-09
9.32E-09
9.17E-09
9.62E-09
9.57E-09
9.55E-09
9.55E-09
9.63E-09
9.31E-09
10
1.15E-08
1.23E-08
1.16E-08
1.18E-08
1.19E-08
1.10E-08
1.17E-08
1.14E-08
1.16E-08
1.15E-08
9.65E-09
9.34E-09
20
1.51E-08
1.59E-08
1.50E-08
1.54E-08
1.52E-08
1.36E-08
1.44E-08
1.39E-08
1.41E-08
1.42E-08
9.59E-09
9.39E-09
30
1.86E-08
1.94E-08
1.83E-08
1.86E-08
1.87E-08
1.57E-08
1.68E-08
1.62E-08
1.64E-08
1.65E-08
9.60E-09
9.35E-09
50
2.60E-08
2.70E-08
2.52E-08
2.55E-08
2.60E-08
2.06E-08
2.21E-08
2.11E-08
2.14E-08
2.16E-08
9.65E-09
9.33E-09
60
2.59E-08
2.71E-08
2.52E-08
2.58E-08
2.60E-08
2.08E-08
2.23E-08
2.14E-08
2.17E-08
2.18E-08
9.66E-09
9.34E-09
70
1.99E-08
2.11E-08
1.96E-08
2.00E-08
2.03E-08
1.82E-08
1.94E-08
1.87E-08
1.91E-08
1.92E-08
9.61E-09
9.27E-09
9.36E-09
3.16E-10
1.02E-08
8.50E-09
1.18E-08
3.29E-10
1.27E-08
1.09E-08
1.53E-08
3.51E-10
1.63E-08
1.44E-08
1.87E-08
4.18E-10
1.99E-08
1.76E-08
2.59E-08
6.74E-10
2.78E-08
2.41E-08
2.60E-08
6.70E-10
2.78E-08
2.42E-08
2.02E-08
5.60E-10
2.17E-08
1.86E-08
9.49E-09
1.82E-10
9.99E-09
8.99E-09
-1.50E-08
PASS
1.50E-08
PASS
1.15E-08
2.65E-10
1.22E-08
1.07E-08
-2.00E-08
PASS
2.00E-08
PASS
1.40E-08
3.16E-10
1.49E-08
1.32E-08
-2.00E-08
PASS
2.00E-08
PASS
1.63E-08
4.07E-10
1.74E-08
1.52E-08
-4.00E-08
PASS
4.00E-08
PASS
2.13E-08
5.65E-10
2.29E-08
1.98E-08
-8.00E-08
PASS
8.00E-08
PASS
2.16E-08
5.68E-10
2.31E-08
2.00E-08
-8.00E-08
PASS
8.00E-08
PASS
1.89E-08
4.85E-10
2.03E-08
1.76E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 1 @ +5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.9. Plot of Negative Input Bias Current 1 @ +5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.9. Raw data for Negative Input Bias Current 1 @ +5V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 1 @ +5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.92E-09
9.73E-09
9.26E-09
9.58E-09
9.24E-09
9.21E-09
9.86E-09
9.69E-09
9.27E-09
9.73E-09
9.66E-09
9.29E-09
10
1.15E-08
1.23E-08
1.17E-08
1.19E-08
1.18E-08
1.11E-08
1.19E-08
1.16E-08
1.11E-08
1.16E-08
9.60E-09
9.38E-09
20
1.50E-08
1.57E-08
1.52E-08
1.52E-08
1.53E-08
1.35E-08
1.45E-08
1.42E-08
1.36E-08
1.41E-08
9.72E-09
9.29E-09
30
1.83E-08
1.94E-08
1.84E-08
1.86E-08
1.86E-08
1.58E-08
1.69E-08
1.64E-08
1.57E-08
1.63E-08
9.60E-09
9.34E-09
50
2.56E-08
2.69E-08
2.56E-08
2.55E-08
2.58E-08
2.03E-08
2.19E-08
2.13E-08
2.07E-08
2.12E-08
9.73E-09
9.35E-09
60
2.57E-08
2.70E-08
2.57E-08
2.57E-08
2.59E-08
2.03E-08
2.19E-08
2.12E-08
2.06E-08
2.12E-08
9.66E-09
9.31E-09
70
2.38E-08
2.57E-08
2.45E-08
2.45E-08
2.46E-08
1.81E-08
1.95E-08
1.90E-08
1.84E-08
1.91E-08
9.71E-09
9.27E-09
9.35E-09
3.17E-10
1.02E-08
8.48E-09
1.18E-08
3.06E-10
1.27E-08
1.10E-08
1.53E-08
2.73E-10
1.60E-08
1.45E-08
1.87E-08
4.21E-10
1.98E-08
1.75E-08
2.59E-08
5.62E-10
2.74E-08
2.43E-08
2.60E-08
5.79E-10
2.76E-08
2.44E-08
2.46E-08
6.56E-10
2.64E-08
2.28E-08
9.55E-09
2.92E-10
1.04E-08
8.75E-09
-1.50E-08
PASS
1.50E-08
PASS
1.15E-08
3.30E-10
1.24E-08
1.06E-08
-2.00E-08
PASS
2.00E-08
PASS
1.40E-08
4.27E-10
1.51E-08
1.28E-08
-2.00E-08
PASS
2.00E-08
PASS
1.62E-08
4.97E-10
1.76E-08
1.48E-08
-4.00E-08
PASS
4.00E-08
PASS
2.11E-08
6.22E-10
2.28E-08
1.94E-08
-8.00E-08
PASS
8.00E-08
PASS
2.10E-08
6.28E-10
2.28E-08
1.93E-08
-8.00E-08
PASS
8.00E-08
PASS
1.88E-08
5.66E-10
2.03E-08
1.72E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 2 @+5V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of Negative Input Bias Current 2 @+5V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.10. Raw data for Negative Input Bias Current 2 @+5V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 2 @+5V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.05E-09
9.60E-09
9.41E-09
9.51E-09
9.50E-09
9.17E-09
9.90E-09
9.60E-09
9.68E-09
9.79E-09
9.73E-09
9.44E-09
10
1.17E-08
1.23E-08
1.17E-08
1.19E-08
1.19E-08
1.11E-08
1.18E-08
1.16E-08
1.16E-08
1.16E-08
9.60E-09
9.42E-09
20
1.52E-08
1.59E-08
1.52E-08
1.53E-08
1.54E-08
1.35E-08
1.44E-08
1.39E-08
1.41E-08
1.43E-08
9.63E-09
9.50E-09
30
1.86E-08
1.93E-08
1.84E-08
1.86E-08
1.88E-08
1.56E-08
1.66E-08
1.61E-08
1.64E-08
1.65E-08
9.60E-09
9.55E-09
50
2.60E-08
2.68E-08
2.57E-08
2.58E-08
2.62E-08
2.04E-08
2.17E-08
2.12E-08
2.14E-08
2.14E-08
9.71E-09
9.56E-09
60
2.61E-08
2.69E-08
2.58E-08
2.57E-08
2.65E-08
2.03E-08
2.16E-08
2.10E-08
2.14E-08
2.15E-08
9.72E-09
9.58E-09
70
2.42E-08
2.59E-08
2.45E-08
2.45E-08
2.51E-08
1.85E-08
1.94E-08
1.88E-08
1.90E-08
1.92E-08
9.58E-09
9.51E-09
9.41E-09
2.14E-10
1.00E-08
8.83E-09
1.19E-08
2.22E-10
1.25E-08
1.13E-08
1.54E-08
2.83E-10
1.62E-08
1.46E-08
1.87E-08
3.33E-10
1.97E-08
1.78E-08
2.61E-08
4.64E-10
2.74E-08
2.48E-08
2.62E-08
5.15E-10
2.76E-08
2.48E-08
2.48E-08
6.84E-10
2.67E-08
2.30E-08
9.63E-09
2.80E-10
1.04E-08
8.86E-09
-1.50E-08
PASS
1.50E-08
PASS
1.15E-08
2.70E-10
1.23E-08
1.08E-08
-2.00E-08
PASS
2.00E-08
PASS
1.40E-08
3.49E-10
1.50E-08
1.31E-08
-2.00E-08
PASS
2.00E-08
PASS
1.62E-08
3.79E-10
1.73E-08
1.52E-08
-4.00E-08
PASS
4.00E-08
PASS
2.12E-08
4.98E-10
2.26E-08
1.99E-08
-8.00E-08
PASS
8.00E-08
PASS
2.12E-08
5.39E-10
2.26E-08
1.97E-08
-8.00E-08
PASS
8.00E-08
PASS
1.90E-08
3.52E-10
1.99E-08
1.80E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio 1 @ +5V (dB)
1.10E+02
1.05E+02
1.00E+02
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.11. Plot of Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.11. Raw data for Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 1 @ +5V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.06E+02
1.05E+02
1.10E+02
1.02E+02
1.07E+02
1.03E+02
1.09E+02
1.02E+02
1.07E+02
1.04E+02
1.04E+02
1.04E+02
10
1.02E+02
1.05E+02
1.07E+02
1.02E+02
1.05E+02
1.04E+02
1.04E+02
1.04E+02
1.11E+02
1.03E+02
1.04E+02
1.02E+02
20
1.03E+02
1.04E+02
1.06E+02
1.03E+02
1.02E+02
1.02E+02
1.03E+02
1.01E+02
1.07E+02
1.01E+02
1.03E+02
1.04E+02
30
1.01E+02
1.04E+02
1.05E+02
1.02E+02
1.05E+02
1.03E+02
1.03E+02
1.00E+02
1.12E+02
1.02E+02
1.05E+02
1.06E+02
50
1.03E+02
1.08E+02
1.10E+02
1.02E+02
1.07E+02
1.04E+02
1.02E+02
1.01E+02
1.07E+02
1.03E+02
1.04E+02
1.06E+02
60
1.02E+02
1.04E+02
1.06E+02
1.03E+02
1.04E+02
1.01E+02
1.03E+02
1.01E+02
1.08E+02
1.03E+02
1.04E+02
1.02E+02
70
1.02E+02
1.07E+02
1.09E+02
9.99E+01
1.17E+02
1.06E+02
1.03E+02
1.02E+02
1.08E+02
1.06E+02
1.02E+02
1.04E+02
1.06E+02
2.90E+00
1.14E+02
9.81E+01
1.04E+02
2.05E+00
1.10E+02
9.85E+01
1.04E+02
1.62E+00
1.08E+02
9.93E+01
1.03E+02
1.94E+00
1.09E+02
9.80E+01
1.06E+02
3.57E+00
1.16E+02
9.62E+01
1.04E+02
1.34E+00
1.07E+02
9.99E+01
1.07E+02
6.57E+00
1.25E+02
8.89E+01
1.05E+02
2.98E+00
1.13E+02
9.68E+01
9.40E+01
PASS
1.05E+02
3.37E+00
1.15E+02
9.60E+01
9.10E+01
PASS
1.03E+02
2.32E+00
1.09E+02
9.63E+01
9.10E+01
PASS
1.04E+02
4.57E+00
1.17E+02
9.15E+01
8.90E+01
PASS
1.04E+02
2.20E+00
1.10E+02
9.75E+01
8.70E+01
PASS
1.03E+02
2.83E+00
1.11E+02
9.56E+01
8.70E+01
PASS
1.05E+02
2.44E+00
1.12E+02
9.82E+01
8.70E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
29
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio 2 @ +5V (dB)
1.10E+02
1.05E+02
1.00E+02
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.12. Plot of Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.12. Raw data for Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 2 @ +5V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.05E+02
1.04E+02
1.04E+02
1.03E+02
1.06E+02
1.07E+02
1.10E+02
1.03E+02
1.03E+02
1.06E+02
1.06E+02
1.04E+02
10
1.06E+02
1.03E+02
1.05E+02
1.01E+02
1.05E+02
1.03E+02
1.06E+02
1.02E+02
1.02E+02
1.04E+02
1.06E+02
1.04E+02
20
1.03E+02
1.06E+02
1.05E+02
1.03E+02
1.10E+02
1.02E+02
1.04E+02
1.01E+02
9.97E+01
1.01E+02
1.06E+02
1.05E+02
30
1.00E+02
1.08E+02
1.04E+02
1.02E+02
1.04E+02
1.07E+02
1.04E+02
1.01E+02
1.00E+02
1.03E+02
1.08E+02
1.02E+02
50
1.03E+02
1.07E+02
1.04E+02
9.96E+01
1.05E+02
1.04E+02
1.05E+02
1.01E+02
9.98E+01
1.02E+02
1.12E+02
1.08E+02
60
1.01E+02
1.04E+02
1.03E+02
1.03E+02
1.05E+02
1.03E+02
1.06E+02
9.99E+01
1.00E+02
1.01E+02
1.05E+02
1.02E+02
70
1.02E+02
1.04E+02
1.05E+02
1.02E+02
1.09E+02
1.13E+02
1.05E+02
1.03E+02
1.04E+02
1.04E+02
1.05E+02
1.07E+02
1.04E+02
9.39E-01
1.07E+02
1.02E+02
1.04E+02
1.83E+00
1.09E+02
9.88E+01
1.05E+02
2.64E+00
1.13E+02
9.81E+01
1.04E+02
3.05E+00
1.12E+02
9.54E+01
1.04E+02
2.78E+00
1.11E+02
9.60E+01
1.03E+02
1.66E+00
1.08E+02
9.86E+01
1.05E+02
2.63E+00
1.12E+02
9.74E+01
1.06E+02
2.96E+00
1.14E+02
9.77E+01
9.40E+01
PASS
1.03E+02
1.76E+00
1.08E+02
9.85E+01
9.10E+01
PASS
1.02E+02
1.56E+00
1.06E+02
9.75E+01
9.10E+01
PASS
1.03E+02
2.77E+00
1.10E+02
9.52E+01
8.90E+01
PASS
1.03E+02
2.07E+00
1.08E+02
9.69E+01
8.70E+01
PASS
1.02E+02
2.44E+00
1.09E+02
9.53E+01
8.70E+01
PASS
1.06E+02
3.83E+00
1.16E+02
9.53E+01
8.70E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
31
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 1 @ +5V (dB)
1.40E+02
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.13. Plot of Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.13. Raw data for Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 1 @ +5V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.34E+02
1.16E+02
1.12E+02
1.23E+02
1.23E+02
1.39E+02
1.29E+02
1.37E+02
1.16E+02
1.36E+02
1.20E+02
1.30E+02
10
1.24E+02
1.21E+02
1.20E+02
1.21E+02
1.34E+02
1.22E+02
1.21E+02
1.28E+02
1.14E+02
1.26E+02
1.16E+02
1.48E+02
20
1.27E+02
1.17E+02
1.16E+02
1.21E+02
1.15E+02
1.34E+02
1.18E+02
1.25E+02
1.12E+02
1.25E+02
1.23E+02
1.61E+02
30
1.20E+02
1.21E+02
1.26E+02
1.33E+02
1.23E+02
1.39E+02
1.25E+02
1.33E+02
1.13E+02
1.26E+02
1.28E+02
1.25E+02
50
1.26E+02
1.12E+02
1.13E+02
1.35E+02
1.17E+02
1.17E+02
1.32E+02
1.24E+02
1.11E+02
1.36E+02
1.32E+02
1.39E+02
60
1.36E+02
1.14E+02
1.19E+02
1.15E+02
1.27E+02
1.28E+02
1.15E+02
1.30E+02
1.09E+02
1.24E+02
1.15E+02
1.32E+02
70
1.19E+02
1.19E+02
1.29E+02
1.28E+02
1.32E+02
1.15E+02
1.27E+02
1.18E+02
1.12E+02
1.18E+02
1.23E+02
1.27E+02
1.22E+02
8.18E+00
1.44E+02
9.92E+01
1.24E+02
5.80E+00
1.40E+02
1.08E+02
1.19E+02
4.94E+00
1.33E+02
1.06E+02
1.24E+02
5.19E+00
1.39E+02
1.10E+02
1.21E+02
9.95E+00
1.48E+02
9.35E+01
1.22E+02
9.32E+00
1.48E+02
9.66E+01
1.25E+02
5.90E+00
1.42E+02
1.09E+02
1.31E+02
9.25E+00
1.57E+02
1.06E+02
1.00E+02
PASS
1.22E+02
5.50E+00
1.38E+02
1.07E+02
1.00E+02
PASS
1.23E+02
8.17E+00
1.45E+02
1.00E+02
1.00E+02
PASS
1.27E+02
9.81E+00
1.54E+02
1.00E+02
1.00E+02
PASS
1.24E+02
1.03E+01
1.52E+02
9.58E+01
9.80E+01
PASS
1.21E+02
8.71E+00
1.45E+02
9.71E+01
9.80E+01
PASS
1.18E+02
5.52E+00
1.33E+02
1.03E+02
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 2 @ +5V (dB)
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.14. Plot of Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.14. Raw data for Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 2 @ +5V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.28E+02
1.13E+02
1.17E+02
1.19E+02
1.21E+02
1.14E+02
1.20E+02
1.16E+02
1.14E+02
1.23E+02
1.15E+02
1.29E+02
10
1.27E+02
1.16E+02
1.21E+02
1.16E+02
1.18E+02
1.16E+02
1.27E+02
1.23E+02
1.17E+02
1.26E+02
1.15E+02
1.20E+02
20
1.38E+02
1.14E+02
1.16E+02
1.18E+02
1.13E+02
1.12E+02
1.21E+02
1.15E+02
1.10E+02
1.15E+02
1.20E+02
1.20E+02
30
1.37E+02
1.13E+02
1.15E+02
1.16E+02
1.16E+02
1.17E+02
1.25E+02
1.17E+02
1.14E+02
1.23E+02
1.21E+02
1.22E+02
50
1.23E+02
1.11E+02
1.16E+02
1.12E+02
1.10E+02
1.14E+02
1.17E+02
1.13E+02
1.12E+02
1.17E+02
1.18E+02
1.17E+02
60
1.27E+02
1.13E+02
1.14E+02
1.10E+02
1.12E+02
1.22E+02
1.18E+02
1.15E+02
1.12E+02
1.17E+02
1.18E+02
1.33E+02
70
1.28E+02
1.21E+02
1.29E+02
1.18E+02
1.16E+02
1.17E+02
1.20E+02
1.17E+02
1.20E+02
1.22E+02
1.19E+02
1.19E+02
1.20E+02
5.39E+00
1.35E+02
1.05E+02
1.20E+02
4.63E+00
1.32E+02
1.07E+02
1.20E+02
1.02E+01
1.48E+02
9.19E+01
1.19E+02
9.77E+00
1.46E+02
9.25E+01
1.14E+02
5.17E+00
1.29E+02
1.00E+02
1.15E+02
6.45E+00
1.33E+02
9.77E+01
1.22E+02
5.96E+00
1.39E+02
1.06E+02
1.17E+02
3.65E+00
1.27E+02
1.07E+02
1.00E+02
PASS
1.22E+02
4.89E+00
1.35E+02
1.08E+02
1.00E+02
PASS
1.15E+02
4.08E+00
1.26E+02
1.04E+02
1.00E+02
PASS
1.19E+02
4.37E+00
1.31E+02
1.07E+02
1.00E+02
PASS
1.15E+02
2.11E+00
1.20E+02
1.09E+02
9.80E+01
PASS
1.17E+02
3.57E+00
1.27E+02
1.07E+02
9.80E+01
PASS
1.19E+02
2.07E+00
1.25E+02
1.13E+02
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
35
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=open (V/mV)
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.15. Plot of Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.15. Raw data for Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=open (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.18E+02
1.04E+03
1.04E+03
1.27E+03
1.53E+03
1.08E+03
9.18E+02
9.63E+02
1.37E+03
1.06E+03
1.03E+03
9.49E+02
10
9.95E+02
1.02E+03
1.24E+03
9.24E+02
1.21E+03
1.04E+03
9.71E+02
1.33E+03
9.51E+02
9.79E+02
1.17E+03
1.61E+03
20
8.93E+02
1.30E+03
1.23E+03
1.39E+03
1.30E+03
1.25E+03
1.24E+03
8.60E+02
1.20E+03
1.04E+03
1.27E+03
1.36E+03
30
9.72E+02
1.04E+03
1.55E+03
1.54E+03
1.10E+03
1.09E+03
1.17E+03
1.28E+03
1.22E+03
1.08E+03
1.11E+03
1.06E+03
50
9.97E+02
1.30E+03
1.63E+03
1.21E+03
1.18E+03
1.24E+03
9.65E+02
1.24E+03
1.18E+03
1.03E+03
9.75E+02
1.16E+03
60
9.09E+02
1.20E+03
1.18E+03
1.21E+03
9.39E+02
1.70E+03
9.79E+02
1.04E+03
1.26E+03
1.23E+03
8.15E+02
1.12E+03
70
9.05E+02
8.62E+02
1.33E+03
8.62E+02
1.08E+03
1.35E+03
9.92E+02
9.35E+02
1.27E+03
9.59E+02
1.04E+03
1.52E+03
1.16E+03
2.44E+02
1.83E+03
4.92E+02
1.08E+03
1.40E+02
1.46E+03
6.96E+02
1.22E+03
1.93E+02
1.75E+03
6.94E+02
1.24E+03
2.82E+02
2.01E+03
4.67E+02
1.26E+03
2.32E+02
1.90E+03
6.27E+02
1.09E+03
1.50E+02
1.50E+03
6.76E+02
1.01E+03
2.02E+02
1.56E+03
4.54E+02
1.08E+03
1.77E+02
1.57E+03
5.93E+02
1.50E+02
PASS
1.05E+03
1.57E+02
1.48E+03
6.25E+02
1.50E+02
PASS
1.12E+03
1.67E+02
1.58E+03
6.61E+02
1.50E+02
PASS
1.17E+03
8.82E+01
1.41E+03
9.26E+02
1.50E+02
PASS
1.13E+03
1.27E+02
1.48E+03
7.81E+02
1.00E+02
PASS
1.24E+03
2.84E+02
2.02E+03
4.62E+02
1.00E+02
PASS
1.10E+03
1.93E+02
1.63E+03
5.70E+02
1.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=open (V/mV)
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.16. Plot of Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.16. Raw data for Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=open (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.47E+02
1.24E+03
1.21E+03
1.35E+03
1.11E+03
1.15E+03
1.10E+03
1.06E+03
1.18E+03
1.01E+03
1.12E+03
1.22E+03
10
9.62E+02
1.03E+03
1.21E+03
1.07E+03
1.11E+03
1.24E+03
1.15E+03
1.36E+03
1.16E+03
9.67E+02
1.04E+03
1.27E+03
20
8.93E+02
1.27E+03
1.23E+03
1.26E+03
1.16E+03
1.15E+03
1.12E+03
1.30E+03
1.26E+03
1.09E+03
1.14E+03
1.24E+03
30
1.06E+03
1.14E+03
1.41E+03
1.06E+03
1.21E+03
9.52E+02
9.13E+02
1.08E+03
1.31E+03
1.01E+03
1.14E+03
1.12E+03
50
9.54E+02
1.15E+03
1.29E+03
1.49E+03
1.44E+03
1.22E+03
9.95E+02
1.30E+03
1.33E+03
8.41E+02
1.22E+03
1.16E+03
60
9.25E+02
1.31E+03
1.51E+03
1.11E+03
1.25E+03
1.62E+03
1.31E+03
1.30E+03
1.04E+03
1.09E+03
9.79E+02
1.05E+03
70
8.38E+02
1.03E+03
1.11E+03
1.15E+03
9.96E+02
1.18E+03
9.81E+02
9.54E+02
1.16E+03
1.10E+03
1.05E+03
1.35E+03
1.15E+03
1.91E+02
1.68E+03
6.27E+02
1.08E+03
9.40E+01
1.34E+03
8.21E+02
1.16E+03
1.56E+02
1.59E+03
7.33E+02
1.18E+03
1.44E+02
1.57E+03
7.82E+02
1.26E+03
2.17E+02
1.86E+03
6.70E+02
1.22E+03
2.17E+02
1.82E+03
6.26E+02
1.02E+03
1.22E+02
1.36E+03
6.90E+02
1.10E+03
7.06E+01
1.29E+03
9.06E+02
1.50E+02
PASS
1.18E+03
1.44E+02
1.57E+03
7.80E+02
1.50E+02
PASS
1.19E+03
9.22E+01
1.44E+03
9.33E+02
1.50E+02
PASS
1.05E+03
1.58E+02
1.49E+03
6.20E+02
1.50E+02
PASS
1.14E+03
2.12E+02
1.72E+03
5.57E+02
1.00E+02
PASS
1.27E+03
2.30E+02
1.90E+03
6.42E+02
1.00E+02
PASS
1.07E+03
1.03E+02
1.36E+03
7.91E+02
1.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
39
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
6.00E+03
4.00E+03
2.00E+03
0.00E+00
-2.00E+03
-4.00E+03
-6.00E+03
-8.00E+03
-1.00E+04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.17. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.17. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.00E+04
3.40E+03
2.54E+03
4.81E+03
3.96E+03
5.36E+03
2.49E+03
2.94E+03
2.15E+03
3.36E+03
1.00E+04
2.59E+03
10
9.22E+03
1.73E+03
1.82E+03
1.83E+03
2.14E+03
1.59E+03
4.43E+03
4.54E+03
1.44E+03
3.57E+03
1.00E+04
3.25E+03
24 hr
Anneal
168 hr
Anneal
20
8.72E+03
1.18E+03
1.12E+03
1.29E+03
1.29E+03
1.71E+03
1.77E+03
1.75E+03
8.08E+02
2.07E+03
1.00E+04
4.21E+03
30
3.48E+03
1.02E+03
9.33E+02
9.85E+02
1.09E+03
1.33E+03
2.43E+03
1.17E+03
6.95E+02
1.51E+03
1.00E+04
2.82E+03
50
1.12E+03
5.83E+02
5.85E+02
5.68E+02
7.01E+02
6.44E+02
8.92E+02
8.41E+02
4.90E+02
7.62E+02
1.00E+04
1.72E+03
60
1.52E+03
5.95E+02
5.55E+02
6.04E+02
6.07E+02
7.31E+02
1.10E+03
9.27E+02
4.72E+02
7.02E+02
3.75E+03
1.58E+03
70
1.00E+04
7.85E+02
1.13E+03
1.16E+03
1.39E+03
1.06E+03
2.21E+03
1.29E+03
7.61E+02
1.56E+03
1.00E+04
4.09E+03
4.94E+03 3.35E+03 2.72E+03
2.95E+03 3.29E+03 3.35E+03
1.30E+04 1.24E+04 1.19E+04
-3.13E+03 -5.66E+03 -6.48E+03
1.50E+03
1.11E+03
4.54E+03
########
7.11E+02
2.33E+02
1.35E+03
7.23E+01
7.76E+02
4.16E+02
1.92E+03
########
2.89E+03
3.98E+03
1.38E+04
########
3.26E+03 3.11E+03 1.62E+03
1.26E+03 1.51E+03 4.76E+02
6.72E+03 7.25E+03 2.93E+03
-1.98E+02 -1.02E+03 3.14E+02
1.20E+02 1.20E+02 1.20E+02
PASS
PASS
PASS
1.43E+03
6.37E+02
3.17E+03
########
5.00E+01
PASS
7.26E+02
1.61E+02
1.17E+03
2.83E+02
2.00E+01
PASS
7.86E+02
2.39E+02
1.44E+03
1.32E+02
2.00E+01
PASS
1.38E+03
5.53E+02
2.89E+03
########
2.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
41
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
3.00E+03
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
-5.00E+02
-1.00E+03
-1.50E+03
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.18. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.18. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.77E+03
1.87E+03
2.69E+03
2.22E+03
1.67E+03
1.56E+03
3.37E+03
2.23E+03
2.44E+03
2.37E+03
2.95E+03
2.78E+03
10
3.57E+03
1.18E+03
1.74E+03
1.47E+03
1.18E+03
1.27E+03
2.48E+03
1.45E+03
1.73E+03
1.74E+03
1.93E+03
3.01E+03
20
1.79E+03
8.82E+02
1.20E+03
9.18E+02
9.07E+02
9.98E+02
1.40E+03
1.13E+03
1.00E+03
1.35E+03
1.64E+03
3.53E+03
30
1.80E+03
8.37E+02
8.06E+02
7.80E+02
7.64E+02
8.76E+02
1.21E+03
8.85E+02
8.71E+02
9.39E+02
2.40E+03
2.63E+03
50
8.97E+02
5.20E+02
5.22E+02
5.30E+02
4.93E+02
6.78E+02
8.85E+02
6.22E+02
5.81E+02
6.17E+02
1.93E+03
2.99E+03
60
9.18E+02
5.78E+02
5.54E+02
5.25E+02
5.04E+02
5.38E+02
8.68E+02
5.71E+02
5.69E+02
6.14E+02
1.95E+03
3.00E+03
70
2.15E+03
9.60E+02
8.94E+02
8.80E+02
8.84E+02
9.38E+02
1.49E+03
1.08E+03
1.11E+03
1.26E+03
2.43E+03
2.93E+03
2.64E+03
1.25E+03
6.07E+03
-7.80E+02
1.83E+03
1.00E+03
4.57E+03
########
1.14E+03
3.85E+02
2.20E+03
8.30E+01
9.97E+02
4.49E+02
2.23E+03
########
5.92E+02
1.71E+02
1.06E+03
1.25E+02
6.15E+02
1.71E+02
1.09E+03
1.45E+02
1.15E+03
5.59E+02
2.69E+03
########
2.39E+03
6.47E+02
4.17E+03
6.19E+02
1.20E+02
PASS
1.73E+03
4.62E+02
3.00E+03
4.69E+02
1.20E+02
PASS
1.17E+03
1.89E+02
1.69E+03
6.58E+02
1.20E+02
PASS
9.56E+02
1.43E+02
1.35E+03
5.62E+02
5.00E+01
PASS
6.76E+02
1.22E+02
1.01E+03
3.43E+02
2.00E+01
PASS
6.32E+02
1.34E+02
1.00E+03
2.63E+02
2.00E+01
PASS
1.18E+03
2.10E+02
1.75E+03
6.00E+02
2.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
43
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V RL=open (V)
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.19. Plot of Output Voltage Low 1 @ +5V RL=open (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.19. Raw data for Output Voltage Low 1 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V RL=open (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.16E-03
4.31E-03
4.23E-03
3.97E-03
4.33E-03
3.89E-03
4.18E-03
3.94E-03
4.43E-03
4.16E-03
4.04E-03
4.29E-03
10
4.34E-03
4.26E-03
4.55E-03
4.58E-03
4.45E-03
4.31E-03
4.13E-03
3.60E-03
4.41E-03
4.18E-03
4.24E-03
4.24E-03
20
4.48E-03
3.96E-03
4.67E-03
4.30E-03
4.24E-03
4.55E-03
4.26E-03
4.33E-03
4.43E-03
4.31E-03
4.09E-03
4.51E-03
30
4.14E-03
4.18E-03
4.46E-03
4.28E-03
4.55E-03
4.60E-03
4.65E-03
4.68E-03
4.33E-03
4.58E-03
4.31E-03
4.02E-03
50
4.14E-03
4.90E-03
4.93E-03
4.45E-03
4.87E-03
4.68E-03
4.98E-03
5.09E-03
5.14E-03
4.95E-03
4.34E-03
4.24E-03
60
4.48E-03
4.80E-03
4.85E-03
4.55E-03
5.02E-03
4.97E-03
4.87E-03
4.78E-03
5.02E-03
4.95E-03
4.43E-03
4.11E-03
70
4.43E-03
4.21E-03
4.75E-03
4.61E-03
4.56E-03
4.55E-03
4.41E-03
4.72E-03
4.72E-03
4.50E-03
4.23E-03
3.89E-03
4.20E-03
1.45E-04
4.60E-03
3.80E-03
4.44E-03
1.36E-04
4.81E-03
4.06E-03
4.33E-03
2.66E-04
5.06E-03
3.60E-03
4.32E-03
1.78E-04
4.81E-03
3.84E-03
4.66E-03
3.50E-04
5.62E-03
3.70E-03
4.74E-03
2.22E-04
5.35E-03
4.13E-03
4.51E-03
2.04E-04
5.07E-03
3.95E-03
4.12E-03
2.16E-04
4.71E-03
3.53E-03
6.00E-03
PASS
4.13E-03
3.14E-04
4.99E-03
3.27E-03
6.00E-03
PASS
4.38E-03
1.15E-04
4.69E-03
4.06E-03
6.00E-03
PASS
4.57E-03
1.39E-04
4.95E-03
4.19E-03
9.00E-03
PASS
4.97E-03
1.79E-04
5.46E-03
4.48E-03
1.30E-02
PASS
4.92E-03
9.42E-05
5.18E-03
4.66E-03
1.30E-02
PASS
4.58E-03
1.37E-04
4.96E-03
4.20E-03
1.30E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
45
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V RL=open (V)
1.40E-02
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.20. Plot of Output Voltage Low 2 @ +5V RL=open (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.20. Raw data for Output Voltage Low 2 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V RL=open (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.01E-03
3.89E-03
4.21E-03
4.14E-03
3.69E-03
4.19E-03
3.72E-03
4.28E-03
4.01E-03
3.67E-03
4.16E-03
3.65E-03
10
3.62E-03
4.16E-03
4.46E-03
3.89E-03
4.34E-03
4.46E-03
4.23E-03
4.28E-03
4.61E-03
4.31E-03
4.29E-03
4.09E-03
20
4.06E-03
4.38E-03
4.04E-03
4.87E-03
4.31E-03
4.43E-03
4.19E-03
4.46E-03
4.33E-03
4.35E-03
4.16E-03
4.21E-03
30
4.33E-03
4.56E-03
4.41E-03
4.50E-03
4.50E-03
4.66E-03
4.46E-03
4.43E-03
4.66E-03
4.87E-03
3.91E-03
4.14E-03
50
4.50E-03
4.41E-03
4.72E-03
4.68E-03
4.85E-03
4.51E-03
4.56E-03
4.97E-03
4.55E-03
4.97E-03
3.84E-03
4.13E-03
60
4.29E-03
4.48E-03
4.77E-03
4.55E-03
4.58E-03
4.95E-03
4.33E-03
4.82E-03
4.80E-03
4.95E-03
4.43E-03
4.28E-03
70
4.28E-03
4.18E-03
4.95E-03
4.75E-03
4.60E-03
4.56E-03
4.50E-03
4.72E-03
4.56E-03
4.53E-03
4.56E-03
3.94E-03
3.99E-03
2.07E-04
4.56E-03
3.42E-03
4.09E-03
3.41E-04
5.03E-03
3.16E-03
4.33E-03
3.36E-04
5.25E-03
3.41E-03
4.46E-03
9.03E-05
4.71E-03
4.21E-03
4.63E-03
1.76E-04
5.12E-03
4.15E-03
4.53E-03
1.74E-04
5.01E-03
4.06E-03
4.55E-03
3.21E-04
5.43E-03
3.67E-03
3.97E-03
2.73E-04
4.72E-03
3.22E-03
6.00E-03
PASS
4.38E-03
1.55E-04
4.80E-03
3.95E-03
6.00E-03
PASS
4.35E-03
1.05E-04
4.64E-03
4.06E-03
6.00E-03
PASS
4.62E-03
1.78E-04
5.11E-03
4.13E-03
9.00E-03
PASS
4.71E-03
2.36E-04
5.36E-03
4.06E-03
1.30E-02
PASS
4.77E-03
2.56E-04
5.47E-03
4.07E-03
1.30E-02
PASS
4.57E-03
8.53E-05
4.81E-03
4.34E-03
1.30E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
47
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V RL=2kΩ (V)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.21. Plot of Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.21. Raw data for Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.21E-03
8.90E-04
1.06E-03
9.90E-04
1.09E-03
1.04E-03
1.11E-03
8.90E-04
9.00E-04
1.09E-03
1.05E-03
1.12E-03
10
1.08E-03
1.17E-03
1.08E-03
8.70E-04
1.01E-03
9.50E-04
1.17E-03
9.30E-04
9.40E-04
8.10E-04
1.11E-03
1.03E-03
20
1.14E-03
9.20E-04
1.11E-03
8.90E-04
1.12E-03
1.14E-03
1.11E-03
9.30E-04
1.04E-03
1.22E-03
1.20E-03
1.01E-03
30
1.00E-03
9.20E-04
1.08E-03
9.80E-04
9.80E-04
9.60E-04
1.12E-03
8.50E-04
9.40E-04
1.03E-03
1.04E-03
1.23E-03
50
1.01E-03
9.30E-04
9.20E-04
8.80E-04
9.10E-04
1.00E-03
8.20E-04
8.90E-04
7.80E-04
7.50E-04
1.09E-03
9.90E-04
60
1.07E-03
8.30E-04
9.30E-04
6.60E-04
7.40E-04
8.90E-04
8.40E-04
9.00E-04
9.50E-04
8.70E-04
9.10E-04
1.12E-03
70
1.09E-03
9.20E-04
7.50E-04
6.80E-04
9.10E-04
9.20E-04
1.02E-03
1.00E-03
1.04E-03
1.02E-03
1.08E-03
1.09E-03
1.05E-03
1.19E-04
1.37E-03
7.22E-04
1.04E-03
1.12E-04
1.35E-03
7.36E-04
1.04E-03
1.21E-04
1.37E-03
7.05E-04
9.92E-04
5.76E-05
1.15E-03
8.34E-04
9.30E-04
4.85E-05
1.06E-03
7.97E-04
8.46E-04
1.61E-04
1.29E-03
4.05E-04
8.70E-04
1.60E-04
1.31E-03
4.30E-04
1.01E-03
1.05E-04
1.29E-03
7.19E-04
2.00E-03
PASS
9.60E-04
1.30E-04
1.32E-03
6.02E-04
2.00E-03
PASS
1.09E-03
1.09E-04
1.39E-03
7.88E-04
2.00E-03
PASS
9.80E-04
1.01E-04
1.26E-03
7.02E-04
2.00E-03
PASS
8.48E-04
9.98E-05
1.12E-03
5.74E-04
2.00E-03
PASS
8.90E-04
4.06E-05
1.00E-03
7.79E-04
2.00E-03
PASS
1.00E-03
4.69E-05
1.13E-03
8.71E-04
2.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
49
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V RL=2kΩ (V)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.22. Plot of Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.22. Raw data for Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.50E-04
1.04E-03
1.12E-03
1.01E-03
8.30E-04
8.80E-04
1.05E-03
9.30E-04
1.07E-03
8.80E-04
1.06E-03
1.06E-03
10
1.10E-03
8.40E-04
9.70E-04
1.01E-03
1.06E-03
9.80E-04
9.90E-04
9.40E-04
1.00E-03
1.10E-03
9.30E-04
9.70E-04
20
9.60E-04
1.09E-03
9.00E-04
1.04E-03
8.80E-04
1.09E-03
9.20E-04
9.50E-04
9.10E-04
9.90E-04
9.60E-04
1.24E-03
30
1.01E-03
9.70E-04
8.20E-04
7.10E-04
7.90E-04
9.80E-04
9.40E-04
9.90E-04
7.50E-04
1.04E-03
1.20E-03
8.90E-04
50
8.80E-04
8.80E-04
7.70E-04
6.90E-04
9.00E-04
8.00E-04
1.01E-03
9.40E-04
9.50E-04
9.40E-04
9.40E-04
9.30E-04
60
7.90E-04
7.30E-04
7.50E-04
8.90E-04
7.50E-04
7.30E-04
9.80E-04
7.10E-04
7.40E-04
9.30E-04
1.11E-03
9.50E-04
70
8.10E-04
8.90E-04
8.60E-04
7.90E-04
7.50E-04
7.70E-04
9.20E-04
8.30E-04
7.40E-04
7.50E-04
9.70E-04
1.03E-03
9.90E-04
1.08E-04
1.29E-03
6.93E-04
9.96E-04
1.00E-04
1.27E-03
7.21E-04
9.74E-04
8.99E-05
1.22E-03
7.28E-04
8.60E-04
1.26E-04
1.21E-03
5.14E-04
8.24E-04
9.07E-05
1.07E-03
5.75E-04
7.82E-04
6.42E-05
9.58E-04
6.06E-04
8.20E-04
5.57E-05
9.73E-04
6.67E-04
9.62E-04
9.20E-05
1.21E-03
7.10E-04
2.00E-03
PASS
1.00E-03
5.93E-05
1.16E-03
8.39E-04
2.00E-03
PASS
9.72E-04
7.29E-05
1.17E-03
7.72E-04
2.00E-03
PASS
9.40E-04
1.12E-04
1.25E-03
6.33E-04
2.00E-03
PASS
9.28E-04
7.73E-05
1.14E-03
7.16E-04
2.00E-03
PASS
8.18E-04
1.27E-04
1.17E-03
4.70E-04
2.00E-03
PASS
8.02E-04
7.46E-05
1.01E-03
5.97E-04
2.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
51
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V IL=100uA (V)
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.23. Plot of Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.23. Raw data for Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V IL=100uA (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.66E-02
7.95E-02
8.00E-02
8.00E-02
7.95E-02
7.93E-02
7.87E-02
8.08E-02
8.00E-02
7.98E-02
8.00E-02
7.91E-02
10
7.82E-02
8.12E-02
8.15E-02
8.21E-02
8.13E-02
8.13E-02
8.01E-02
8.24E-02
8.15E-02
8.14E-02
8.06E-02
7.97E-02
20
7.95E-02
8.20E-02
8.24E-02
8.26E-02
8.26E-02
8.20E-02
8.09E-02
8.34E-02
8.29E-02
8.22E-02
8.03E-02
8.00E-02
30
8.12E-02
8.41E-02
8.53E-02
8.47E-02
8.42E-02
8.36E-02
8.23E-02
8.47E-02
8.44E-02
8.36E-02
8.03E-02
8.03E-02
50
8.32E-02
8.69E-02
8.76E-02
8.79E-02
8.71E-02
8.61E-02
8.49E-02
8.74E-02
8.67E-02
8.62E-02
8.10E-02
8.03E-02
60
8.42E-02
8.74E-02
8.79E-02
8.81E-02
8.72E-02
8.62E-02
8.50E-02
8.74E-02
8.71E-02
8.65E-02
8.20E-02
8.11E-02
70
8.28E-02
8.60E-02
8.69E-02
8.65E-02
8.64E-02
8.43E-02
8.35E-02
8.52E-02
8.48E-02
8.44E-02
8.04E-02
7.99E-02
7.91E-02
1.44E-03
8.31E-02
7.52E-02
8.08E-02
1.54E-03
8.51E-02
7.66E-02
8.18E-02
1.31E-03
8.54E-02
7.82E-02
8.39E-02
1.58E-03
8.82E-02
7.96E-02
8.65E-02
1.89E-03
9.17E-02
8.14E-02
8.70E-02
1.62E-03
9.14E-02
8.25E-02
8.57E-02
1.68E-03
9.03E-02
8.11E-02
7.97E-02
8.03E-04
8.19E-02
7.75E-02
1.30E-01
PASS
8.14E-02
8.40E-04
8.37E-02
7.91E-02
1.30E-01
PASS
8.23E-02
9.19E-04
8.48E-02
7.98E-02
1.30E-01
PASS
8.37E-02
9.49E-04
8.63E-02
8.11E-02
1.40E-01
PASS
8.62E-02
9.30E-04
8.88E-02
8.37E-02
1.50E-01
PASS
8.64E-02
9.37E-04
8.90E-02
8.38E-02
1.50E-01
PASS
8.44E-02
6.26E-04
8.61E-02
8.27E-02
1.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
53
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V IL=100uA (V)
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.24. Plot of Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.24. Raw data for Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V IL=100uA (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.78E-02
8.02E-02
7.97E-02
8.07E-02
7.97E-02
7.94E-02
7.97E-02
8.08E-02
8.12E-02
7.97E-02
7.96E-02
7.92E-02
10
7.95E-02
8.18E-02
8.12E-02
8.26E-02
8.18E-02
8.16E-02
8.12E-02
8.29E-02
8.24E-02
8.20E-02
8.01E-02
8.05E-02
20
7.97E-02
8.27E-02
8.20E-02
8.34E-02
8.27E-02
8.10E-02
8.18E-02
8.37E-02
8.34E-02
8.32E-02
7.97E-02
8.00E-02
30
8.20E-02
8.43E-02
8.39E-02
8.52E-02
8.41E-02
8.33E-02
8.32E-02
8.50E-02
8.51E-02
8.44E-02
8.00E-02
8.00E-02
50
8.47E-02
8.75E-02
8.70E-02
8.82E-02
8.76E-02
8.60E-02
8.52E-02
8.80E-02
8.75E-02
8.65E-02
8.02E-02
7.99E-02
60
8.48E-02
8.79E-02
8.71E-02
8.85E-02
8.81E-02
8.60E-02
8.62E-02
8.83E-02
8.78E-02
8.75E-02
8.16E-02
8.06E-02
70
8.43E-02
8.65E-02
8.62E-02
8.70E-02
8.66E-02
8.36E-02
8.39E-02
8.59E-02
8.59E-02
8.47E-02
8.03E-02
8.02E-02
7.96E-02
1.09E-03
8.26E-02
7.67E-02
8.14E-02
1.19E-03
8.46E-02
7.81E-02
8.21E-02
1.42E-03
8.60E-02
7.82E-02
8.39E-02
1.19E-03
8.72E-02
8.06E-02
8.70E-02
1.36E-03
9.07E-02
8.33E-02
8.72E-02
1.48E-03
9.13E-02
8.32E-02
8.61E-02
1.07E-03
8.91E-02
8.32E-02
8.02E-02
7.91E-04
8.23E-02
7.80E-02
1.30E-01
PASS
8.20E-02
6.60E-04
8.38E-02
8.02E-02
1.30E-01
PASS
8.26E-02
1.18E-03
8.58E-02
7.94E-02
1.30E-01
PASS
8.42E-02
8.92E-04
8.67E-02
8.18E-02
1.40E-01
PASS
8.66E-02
1.12E-03
8.97E-02
8.36E-02
1.50E-01
PASS
8.71E-02
1.00E-03
8.99E-02
8.44E-02
1.50E-01
PASS
8.48E-02
1.07E-03
8.77E-02
8.18E-02
1.50E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
55
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +5V RL=open (V)
4.38E+00
4.36E+00
4.34E+00
4.32E+00
4.30E+00
4.28E+00
4.26E+00
4.24E+00
4.22E+00
4.20E+00
4.18E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.25. Plot of Output Voltage High 1 @ +5V RL=open (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.25. Raw data for Output Voltage High 1 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +5V RL=open (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.33E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.33E+00
10
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.35E+00
4.34E+00
4.34E+00
4.35E+00
4.35E+00
4.34E+00
4.34E+00
4.34E+00
20
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
30
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
4.34E+00
50
4.35E+00
4.36E+00
4.36E+00
4.27E+00
4.36E+00
4.36E+00
4.35E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.34E+00
60
4.36E+00
4.36E+00
4.36E+00
4.26E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.35E+00
70
4.35E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
4.34E+00
1.73E-03
4.34E+00
4.33E+00
4.34E+00
1.92E-03
4.35E+00
4.34E+00
4.34E+00
1.52E-03
4.35E+00
4.34E+00
4.35E+00
2.19E-03
4.36E+00
4.34E+00
4.34E+00
3.88E-02
4.45E+00
4.23E+00
4.34E+00
4.43E-02
4.46E+00
4.22E+00
4.36E+00
1.95E-03
4.36E+00
4.35E+00
4.34E+00
1.30E-03
4.34E+00
4.33E+00
4.20E+00
PASS
4.34E+00
1.30E-03
4.35E+00
4.34E+00
4.20E+00
PASS
4.34E+00
1.52E-03
4.35E+00
4.34E+00
4.20E+00
PASS
4.35E+00
1.48E-03
4.35E+00
4.35E+00
4.20E+00
PASS
4.36E+00
1.92E-03
4.36E+00
4.35E+00
4.20E+00
PASS
4.36E+00
3.05E-03
4.37E+00
4.35E+00
4.20E+00
PASS
4.35E+00
1.58E-03
4.36E+00
4.35E+00
4.20E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
57
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +5V RL=open (V)
4.38E+00
4.36E+00
4.34E+00
4.32E+00
4.30E+00
4.28E+00
4.26E+00
4.24E+00
4.22E+00
4.20E+00
4.18E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.26. Plot of Output Voltage High 2 @ +5V RL=open (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.26. Raw data for Output Voltage High 2 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +5V RL=open (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.33E+00
4.34E+00
4.33E+00
4.33E+00
4.33E+00
4.33E+00
4.33E+00
4.34E+00
4.34E+00
4.33E+00
4.33E+00
4.33E+00
10
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
20
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.34E+00
4.33E+00
4.34E+00
30
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
4.34E+00
50
4.36E+00
4.36E+00
4.35E+00
4.36E+00
4.36E+00
4.35E+00
4.35E+00
4.36E+00
4.36E+00
4.35E+00
4.34E+00
4.34E+00
60
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.35E+00
4.35E+00
70
4.36E+00
4.36E+00
4.35E+00
4.36E+00
4.36E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.34E+00
4.34E+00
4.33E+00
7.07E-04
4.34E+00
4.33E+00
4.34E+00
1.14E-03
4.34E+00
4.34E+00
4.34E+00
1.52E-03
4.34E+00
4.34E+00
4.35E+00
1.52E-03
4.35E+00
4.34E+00
4.36E+00
1.30E-03
4.36E+00
4.35E+00
4.36E+00
1.52E-03
4.36E+00
4.36E+00
4.36E+00
1.34E-03
4.36E+00
4.35E+00
4.33E+00
1.67E-03
4.34E+00
4.33E+00
4.20E+00
PASS
4.34E+00
1.64E-03
4.35E+00
4.34E+00
4.20E+00
PASS
4.34E+00
1.92E-03
4.35E+00
4.33E+00
4.20E+00
PASS
4.35E+00
1.48E-03
4.35E+00
4.34E+00
4.20E+00
PASS
4.35E+00
1.58E-03
4.36E+00
4.35E+00
4.20E+00
PASS
4.36E+00
3.03E-03
4.37E+00
4.35E+00
4.20E+00
PASS
4.35E+00
1.92E-03
4.36E+00
4.34E+00
4.20E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
59
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +5V RL=2kΩ (V)
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.27. Plot of Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.27. Raw data for Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +5V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
3.98E+00
3.96E+00
3.95E+00
3.95E+00
3.96E+00
3.95E+00
3.97E+00
3.95E+00
3.95E+00
3.96E+00
3.97E+00
3.95E+00
10
3.98E+00
3.96E+00
3.96E+00
3.95E+00
3.96E+00
3.95E+00
3.97E+00
3.95E+00
3.95E+00
3.96E+00
3.97E+00
3.96E+00
20
3.97E+00
3.96E+00
3.95E+00
3.95E+00
3.95E+00
3.95E+00
3.96E+00
3.95E+00
3.95E+00
3.95E+00
3.97E+00
3.96E+00
30
3.98E+00
3.96E+00
3.95E+00
3.95E+00
3.96E+00
3.95E+00
3.97E+00
3.95E+00
3.95E+00
3.95E+00
3.97E+00
3.96E+00
50
3.97E+00
3.96E+00
3.95E+00
3.95E+00
3.96E+00
3.95E+00
3.97E+00
3.95E+00
3.95E+00
3.95E+00
3.97E+00
3.96E+00
60
3.98E+00
3.96E+00
3.95E+00
3.95E+00
3.96E+00
3.95E+00
3.97E+00
3.95E+00
3.95E+00
3.96E+00
3.98E+00
3.96E+00
70
3.98E+00
3.96E+00
3.96E+00
3.95E+00
3.96E+00
3.95E+00
3.97E+00
3.95E+00
3.95E+00
3.96E+00
3.97E+00
3.96E+00
3.96E+00
9.29E-03
3.99E+00
3.93E+00
3.96E+00
9.24E-03
3.99E+00
3.94E+00
3.96E+00
9.49E-03
3.98E+00
3.93E+00
3.96E+00
9.50E-03
3.99E+00
3.93E+00
3.96E+00
9.86E-03
3.98E+00
3.93E+00
3.96E+00
1.01E-02
3.99E+00
3.93E+00
3.96E+00
1.03E-02
3.99E+00
3.93E+00
3.95E+00
6.98E-03
3.97E+00
3.94E+00
3.50E+00
PASS
3.96E+00
7.09E-03
3.98E+00
3.94E+00
3.50E+00
PASS
3.95E+00
7.27E-03
3.97E+00
3.93E+00
3.50E+00
PASS
3.95E+00
7.09E-03
3.97E+00
3.93E+00
3.50E+00
PASS
3.95E+00
7.40E-03
3.97E+00
3.93E+00
3.50E+00
PASS
3.96E+00
7.18E-03
3.97E+00
3.94E+00
3.50E+00
PASS
3.96E+00
7.11E-03
3.97E+00
3.94E+00
3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
61
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +5V RL=2kΩ (V)
4.10E+00
4.00E+00
3.90E+00
3.80E+00
3.70E+00
3.60E+00
3.50E+00
3.40E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.28. Plot of Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.28. Raw data for Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +5V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.00E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
10
4.00E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
3.99E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
20
4.00E+00
3.98E+00
3.97E+00
3.97E+00
3.98E+00
3.97E+00
3.99E+00
3.97E+00
3.97E+00
3.98E+00
3.99E+00
3.98E+00
30
4.00E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
3.97E+00
3.98E+00
4.00E+00
3.98E+00
50
4.00E+00
3.98E+00
3.97E+00
3.97E+00
3.98E+00
3.97E+00
3.99E+00
3.97E+00
3.97E+00
3.98E+00
4.00E+00
3.98E+00
60
4.00E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
3.98E+00
3.98E+00
4.00E+00
3.99E+00
70
4.00E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.98E+00
3.99E+00
3.98E+00
3.98E+00
3.98E+00
4.00E+00
3.98E+00
3.98E+00
8.61E-03
4.01E+00
3.96E+00
3.98E+00
9.20E-03
4.01E+00
3.96E+00
3.98E+00
9.45E-03
4.01E+00
3.95E+00
3.98E+00
9.01E-03
4.01E+00
3.96E+00
3.98E+00
9.19E-03
4.01E+00
3.96E+00
3.98E+00
9.63E-03
4.01E+00
3.96E+00
3.98E+00
9.86E-03
4.01E+00
3.96E+00
3.98E+00
5.79E-03
3.99E+00
3.96E+00
3.50E+00
PASS
3.98E+00
6.50E-03
4.00E+00
3.96E+00
3.50E+00
PASS
3.98E+00
6.36E-03
3.99E+00
3.96E+00
3.50E+00
PASS
3.98E+00
6.22E-03
4.00E+00
3.96E+00
3.50E+00
PASS
3.98E+00
6.50E-03
3.99E+00
3.96E+00
3.50E+00
PASS
3.98E+00
6.11E-03
4.00E+00
3.96E+00
3.50E+00
PASS
3.98E+00
6.07E-03
4.00E+00
3.96E+00
3.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
63
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Slew Rate 1 @ +5V (V/us)
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.29. Plot of Positive Slew Rate 1 @ +5V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.29. Raw data for Positive Slew Rate 1 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 1 @ +5V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.01E-01
9.80E-02
9.50E-02
8.90E-02
9.80E-02
9.00E-02
9.80E-02
8.80E-02
9.40E-02
9.50E-02
9.60E-02
9.50E-02
10
9.90E-02
9.60E-02
9.40E-02
8.60E-02
9.60E-02
8.90E-02
9.70E-02
8.70E-02
9.30E-02
9.40E-02
9.70E-02
9.60E-02
20
9.70E-02
9.40E-02
9.10E-02
8.50E-02
9.50E-02
8.70E-02
9.40E-02
8.50E-02
9.10E-02
9.20E-02
9.70E-02
9.50E-02
30
9.70E-02
9.10E-02
8.90E-02
8.40E-02
9.20E-02
8.50E-02
9.30E-02
8.40E-02
8.80E-02
8.90E-02
9.80E-02
9.60E-02
50
9.20E-02
8.80E-02
8.60E-02
8.00E-02
8.90E-02
8.20E-02
8.90E-02
8.00E-02
8.50E-02
8.60E-02
9.70E-02
9.60E-02
60
9.20E-02
8.80E-02
8.60E-02
8.00E-02
8.90E-02
8.20E-02
9.00E-02
8.10E-02
8.50E-02
8.80E-02
9.80E-02
9.70E-02
70
9.40E-02
9.00E-02
8.80E-02
8.20E-02
8.90E-02
8.60E-02
9.30E-02
8.50E-02
8.90E-02
9.10E-02
9.80E-02
9.60E-02
9.62E-02
4.55E-03
1.09E-01
8.37E-02
9.42E-02
4.92E-03
1.08E-01
8.07E-02
9.24E-02
4.67E-03
1.05E-01
7.96E-02
9.06E-02
4.72E-03
1.04E-01
7.77E-02
8.70E-02
4.47E-03
9.93E-02
7.47E-02
8.70E-02
4.47E-03
9.93E-02
7.47E-02
8.86E-02
4.34E-03
1.00E-01
7.67E-02
9.30E-02
4.00E-03
1.04E-01
8.20E-02
4.00E-02
PASS
9.20E-02
4.00E-03
1.03E-01
8.10E-02
4.00E-02
PASS
8.98E-02
3.70E-03
9.99E-02
7.97E-02
4.00E-02
PASS
8.78E-02
3.56E-03
9.76E-02
7.80E-02
3.00E-02
PASS
8.44E-02
3.51E-03
9.40E-02
7.48E-02
2.00E-02
PASS
8.52E-02
3.83E-03
9.57E-02
7.47E-02
2.00E-02
PASS
8.88E-02
3.35E-03
9.80E-02
7.96E-02
2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
65
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Slew Rate 2 @ +5V (V/us)
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.30. Plot of Positive Slew Rate 2 @ +5V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.30. Raw data for Positive Slew Rate 2 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 2 @ +5V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.01E-01
9.70E-02
9.50E-02
8.90E-02
9.80E-02
9.00E-02
9.90E-02
9.00E-02
9.50E-02
9.70E-02
9.70E-02
9.60E-02
10
9.90E-02
9.70E-02
9.40E-02
8.70E-02
9.70E-02
8.90E-02
9.70E-02
8.80E-02
9.40E-02
9.50E-02
9.80E-02
9.50E-02
20
9.80E-02
9.20E-02
9.00E-02
8.50E-02
9.40E-02
8.60E-02
9.60E-02
8.50E-02
9.20E-02
9.40E-02
9.80E-02
9.60E-02
30
9.60E-02
9.30E-02
8.90E-02
8.40E-02
9.30E-02
8.50E-02
9.50E-02
8.40E-02
8.90E-02
9.00E-02
9.80E-02
9.50E-02
50
9.20E-02
8.90E-02
8.50E-02
8.00E-02
8.80E-02
8.10E-02
9.10E-02
8.00E-02
8.50E-02
8.60E-02
9.80E-02
9.50E-02
60
9.40E-02
8.90E-02
8.60E-02
8.00E-02
8.80E-02
8.30E-02
9.10E-02
8.10E-02
8.50E-02
8.70E-02
9.90E-02
9.70E-02
70
9.60E-02
9.00E-02
8.70E-02
8.30E-02
9.00E-02
8.60E-02
9.40E-02
8.50E-02
8.90E-02
9.10E-02
9.70E-02
9.60E-02
9.60E-02
4.47E-03
1.08E-01
8.37E-02
9.48E-02
4.71E-03
1.08E-01
8.19E-02
9.18E-02
4.82E-03
1.05E-01
7.86E-02
9.10E-02
4.64E-03
1.04E-01
7.83E-02
8.68E-02
4.55E-03
9.93E-02
7.43E-02
8.74E-02
5.08E-03
1.01E-01
7.35E-02
8.92E-02
4.76E-03
1.02E-01
7.61E-02
9.42E-02
4.09E-03
1.05E-01
8.30E-02
4.00E-02
PASS
9.26E-02
3.91E-03
1.03E-01
8.19E-02
4.00E-02
PASS
9.06E-02
4.88E-03
1.04E-01
7.72E-02
4.00E-02
PASS
8.86E-02
4.39E-03
1.01E-01
7.66E-02
3.00E-02
PASS
8.46E-02
4.39E-03
9.66E-02
7.26E-02
2.00E-02
PASS
8.54E-02
3.85E-03
9.59E-02
7.49E-02
2.00E-02
PASS
8.90E-02
3.67E-03
9.91E-02
7.89E-02
2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
67
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
0.00E+00
Negative Slew Rate 1 @ +5V (V/us)
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.31. Plot of Negative Slew Rate 1 @ +5V (V/us) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.31. Raw data for Negative Slew Rate 1 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 1 @ +5V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-6.00E-02
-5.80E-02
-5.70E-02
-5.50E-02
-5.80E-02
-5.60E-02
-5.80E-02
-5.40E-02
-5.60E-02
-5.70E-02
-5.80E-02
-5.60E-02
10
-6.10E-02
-5.80E-02
-5.80E-02
-5.40E-02
-5.70E-02
-5.60E-02
-6.00E-02
-5.40E-02
-5.90E-02
-5.80E-02
-5.90E-02
-6.00E-02
20
-6.10E-02
-5.70E-02
-5.50E-02
-5.40E-02
-5.60E-02
-5.60E-02
-5.90E-02
-4.40E-02
-5.60E-02
-5.90E-02
-5.90E-02
-5.80E-02
30
-6.20E-02
-5.80E-02
-5.60E-02
-5.40E-02
-5.80E-02
-5.80E-02
-5.90E-02
-5.50E-02
-5.60E-02
-5.80E-02
-5.90E-02
-5.90E-02
50
-6.20E-02
-5.70E-02
-5.50E-02
-5.30E-02
-5.60E-02
-5.60E-02
-6.20E-02
-5.50E-02
-5.70E-02
-5.80E-02
-6.00E-02
-5.90E-02
24 hr
Anneal
168 hr
Anneal
60
-6.30E-02
-5.70E-02
-5.60E-02
-5.30E-02
-5.70E-02
-5.60E-02
-6.10E-02
-5.50E-02
-5.70E-02
-5.90E-02
-5.90E-02
-5.80E-02
70
-6.60E-02
-6.00E-02
-5.80E-02
-5.70E-02
-5.90E-02
-5.90E-02
-6.10E-02
-5.80E-02
-5.90E-02
-6.00E-02
-6.10E-02
-6.00E-02
-5.76E-02 -5.76E-02 -5.66E-02 -5.76E-02 -5.66E-02 -5.72E-02 -6.00E-02
1.82E-03 2.51E-03 2.70E-03 2.97E-03 3.36E-03 3.63E-03 3.54E-03
-5.26E-02 -5.07E-02 -4.92E-02 -4.95E-02 -4.74E-02 -4.72E-02 -5.03E-02
-6.26E-02 -6.45E-02 -6.40E-02 -6.57E-02 -6.58E-02 -6.72E-02 -6.97E-02
-5.62E-02
1.48E-03
-5.21E-02
-6.03E-02
-4.00E-02
PASS
-5.74E-02
2.41E-03
-5.08E-02
-6.40E-02
-4.00E-02
PASS
-5.48E-02
6.22E-03
-3.77E-02
-7.19E-02
-4.00E-02
PASS
-5.72E-02
1.64E-03
-5.27E-02
-6.17E-02
-3.00E-02
PASS
-5.76E-02
2.70E-03
-5.02E-02
-6.50E-02
-2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
69
-5.76E-02
2.41E-03
-5.10E-02
-6.42E-02
-2.00E-02
PASS
-5.94E-02
1.14E-03
-5.63E-02
-6.25E-02
-2.00E-02
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Slew Rate 2 @ +5V (V/us)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
-7.00E-02
-8.00E-02
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.32. Plot of Negative Slew Rate 2 @ +5V (V/us) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.32. Raw data for Negative Slew Rate 2 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 2 @ +5V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-6.10E-02
-5.90E-02
-5.60E-02
-5.40E-02
-5.90E-02
-5.50E-02
-6.00E-02
-5.40E-02
-5.60E-02
-5.70E-02
-5.80E-02
-5.70E-02
10
-6.20E-02
-6.00E-02
-5.70E-02
-5.40E-02
-5.80E-02
-5.40E-02
-5.90E-02
-5.40E-02
-5.60E-02
-5.70E-02
-5.90E-02
-5.80E-02
20
-5.90E-02
-5.70E-02
-5.50E-02
-5.20E-02
-5.60E-02
-5.50E-02
-5.80E-02
-5.30E-02
-5.50E-02
-5.60E-02
-6.00E-02
-5.80E-02
30
-6.00E-02
-5.70E-02
-5.50E-02
-5.30E-02
-5.70E-02
-5.70E-02
-5.90E-02
-5.30E-02
-5.60E-02
-5.70E-02
-5.90E-02
-5.80E-02
50
-5.90E-02
-5.60E-02
-5.40E-02
-5.10E-02
-5.40E-02
-5.60E-02
-5.80E-02
-5.10E-02
-5.50E-02
-5.60E-02
-6.00E-02
-5.80E-02
24 hr
Anneal
168 hr
Anneal
60
-5.90E-02
-5.60E-02
-5.50E-02
-5.20E-02
-5.70E-02
-5.50E-02
-6.00E-02
-5.30E-02
-5.40E-02
-5.60E-02
-6.00E-02
-5.80E-02
70
-6.40E-02
-5.80E-02
-5.60E-02
-5.50E-02
-5.80E-02
-5.80E-02
-6.00E-02
-5.60E-02
-5.80E-02
-5.90E-02
-6.20E-02
-5.80E-02
-5.78E-02 -5.82E-02 -5.58E-02 -5.64E-02 -5.48E-02 -5.58E-02 -5.82E-02
2.77E-03 3.03E-03 2.59E-03 2.61E-03 2.95E-03 2.59E-03 3.49E-03
-5.02E-02 -4.99E-02 -4.87E-02 -4.92E-02 -4.67E-02 -4.87E-02 -4.86E-02
-6.54E-02 -6.65E-02 -6.29E-02 -6.36E-02 -6.29E-02 -6.29E-02 -6.78E-02
-5.64E-02
2.30E-03
-5.01E-02
-6.27E-02
-4.00E-02
PASS
-5.60E-02
2.12E-03
-5.02E-02
-6.18E-02
-4.00E-02
PASS
-5.54E-02
1.82E-03
-5.04E-02
-6.04E-02
-4.00E-02
PASS
-5.64E-02
2.19E-03
-5.04E-02
-6.24E-02
-3.00E-02
PASS
-5.52E-02
2.59E-03
-4.81E-02
-6.23E-02
-2.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
71
-5.56E-02
2.70E-03
-4.82E-02
-6.30E-02
-2.00E-02
PASS
-5.82E-02
1.48E-03
-5.41E-02
-6.23E-02
-2.00E-02
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Supply Current @+15V (A)
2.50E-04
2.00E-04
1.50E-04
1.00E-04
5.00E-05
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.33. Plot of Positive Supply Current @+15V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.33. Raw data for Positive Supply Current @+15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @+15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.30E-04
1.13E-04
1.12E-04
1.16E-04
1.20E-04
1.13E-04
1.17E-04
1.13E-04
1.15E-04
1.19E-04
1.18E-04
1.15E-04
10
1.18E-04
1.13E-04
1.11E-04
1.11E-04
1.12E-04
1.11E-04
1.17E-04
1.14E-04
1.15E-04
1.11E-04
1.21E-04
1.18E-04
20
1.21E-04
1.09E-04
1.14E-04
1.03E-04
1.09E-04
1.09E-04
1.15E-04
1.03E-04
1.06E-04
1.05E-04
1.21E-04
1.17E-04
30
1.17E-04
1.03E-04
1.04E-04
1.08E-04
1.06E-04
1.07E-04
1.10E-04
9.90E-05
1.00E-04
1.12E-04
1.21E-04
1.23E-04
50
1.10E-04
9.70E-05
9.50E-05
9.60E-05
9.90E-05
9.90E-05
1.07E-04
9.60E-05
9.90E-05
9.30E-05
1.27E-04
1.19E-04
60
1.09E-04
1.02E-04
1.02E-04
9.70E-05
1.00E-04
1.00E-04
1.08E-04
1.01E-04
1.02E-04
9.80E-05
1.20E-04
1.22E-04
70
1.15E-04
9.90E-05
1.09E-04
9.90E-05
1.01E-04
1.11E-04
1.18E-04
9.80E-05
1.03E-04
1.03E-04
1.23E-04
1.24E-04
1.18E-04
7.29E-06
1.38E-04
9.82E-05
1.13E-04
2.92E-06
1.21E-04
1.05E-04
1.11E-04
6.72E-06
1.30E-04
9.28E-05
1.08E-04
5.59E-06
1.23E-04
9.23E-05
9.94E-05
6.11E-06
1.16E-04
8.27E-05
1.02E-04
4.42E-06
1.14E-04
8.99E-05
1.05E-04
7.13E-06
1.24E-04
8.51E-05
1.15E-04
2.61E-06
1.23E-04
1.08E-04
2.00E-04
PASS
1.14E-04
2.61E-06
1.21E-04
1.06E-04
2.00E-04
PASS
1.08E-04
4.67E-06
1.20E-04
9.48E-05
2.00E-04
PASS
1.06E-04
5.86E-06
1.22E-04
8.95E-05
2.00E-04
PASS
9.88E-05
5.22E-06
1.13E-04
8.45E-05
2.00E-04
PASS
1.02E-04
3.77E-06
1.12E-04
9.15E-05
2.00E-04
PASS
1.07E-04
7.89E-06
1.28E-04
8.50E-05
2.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
73
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @+15V (A)
0.00E+00
-5.00E-05
-1.00E-04
-1.50E-04
-2.00E-04
-2.50E-04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.34. Plot of Negative Supply Current @+15V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.34. Raw data for Negative Supply Current @+15V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @+15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
-1.25E-04
-1.16E-04
-1.17E-04
-1.13E-04
-1.17E-04
-1.16E-04
-1.21E-04
-1.11E-04
-1.14E-04
-1.16E-04
-1.21E-04
-1.18E-04
10
-1.23E-04
-1.14E-04
-1.13E-04
-1.11E-04
-1.15E-04
-1.13E-04
-1.18E-04
-1.08E-04
-1.09E-04
-1.13E-04
-1.21E-04
-1.20E-04
20
-1.20E-04
-1.09E-04
-1.09E-04
-1.08E-04
-1.10E-04
-1.08E-04
-1.14E-04
-1.07E-04
-1.07E-04
-1.09E-04
-1.20E-04
-1.20E-04
30
-1.16E-04
-1.06E-04
-1.09E-04
-1.02E-04
-1.07E-04
-1.05E-04
-1.12E-04
-1.03E-04
-1.04E-04
-1.06E-04
-1.21E-04
-1.20E-04
50
-1.12E-04
-9.90E-05
-1.00E-04
-9.50E-05
-1.01E-04
-1.01E-04
-1.06E-04
-9.80E-05
-9.70E-05
-1.00E-04
-1.21E-04
-1.17E-04
60
-1.10E-04
-1.00E-04
-9.80E-05
-9.60E-05
-9.90E-05
-1.02E-04
-1.06E-04
-9.60E-05
-9.90E-05
-1.00E-04
-1.22E-04
-1.20E-04
70
-1.12E-04
-1.02E-04
-1.02E-04
-1.00E-04
-1.02E-04
-1.06E-04
-1.11E-04
-1.02E-04
-1.02E-04
-1.06E-04
-1.20E-04
-1.19E-04
-1.18E-04
4.45E-06
-1.05E-04
-1.30E-04
-1.15E-04
4.60E-06
-1.03E-04
-1.28E-04
-1.11E-04
4.97E-06
-9.76E-05
-1.25E-04
-1.08E-04
5.15E-06
-9.39E-05
-1.22E-04
-1.01E-04
6.35E-06
-8.40E-05
-1.19E-04
-1.01E-04
5.46E-06
-8.56E-05
-1.16E-04
-1.04E-04
4.77E-06
-9.05E-05
-1.17E-04
-1.16E-04
3.65E-06
-1.06E-04
-1.26E-04
-2.00E-04
PASS
-1.12E-04
3.96E-06
-1.01E-04
-1.23E-04
-2.00E-04
PASS
-1.09E-04
2.92E-06
-1.01E-04
-1.17E-04
-2.00E-04
PASS
-1.06E-04
3.54E-06
-9.63E-05
-1.16E-04
-2.00E-04
PASS
-1.00E-04
3.51E-06
-9.08E-05
-1.10E-04
-2.00E-04
PASS
-1.01E-04
3.71E-06
-9.04E-05
-1.11E-04
-2.00E-04
PASS
-1.05E-04
3.71E-06
-9.52E-05
-1.16E-04
-2.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
75
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 1 @ +15V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.35. Plot of Input Offset Voltage 1 @ +15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
76
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.35. Raw data for Input Offset Voltage 1 @ +15V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 @ +15V (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.44E-05
-5.13E-05
-3.25E-05
6.18E-05
2.67E-05
6.26E-06
6.24E-05
2.27E-05
4.38E-05
8.24E-05
2.82E-05
2.12E-05
10
3.95E-05
-5.96E-05
-3.66E-05
5.53E-05
1.50E-05
-2.17E-06
5.37E-05
1.56E-05
3.58E-05
7.50E-05
2.76E-05
2.39E-05
20
4.09E-05
-4.78E-05
-2.79E-05
6.47E-05
2.38E-05
1.33E-06
5.17E-05
1.05E-05
3.98E-05
7.61E-05
2.98E-05
2.35E-05
30
4.75E-05
-3.97E-05
-1.94E-05
7.82E-05
2.97E-05
6.75E-06
5.10E-05
8.32E-06
4.12E-05
7.65E-05
2.91E-05
2.68E-05
50
5.42E-05
-2.15E-05
1.55E-06
9.76E-05
5.21E-05
1.28E-05
5.20E-05
1.28E-05
5.07E-05
8.13E-05
2.45E-05
2.73E-05
60
5.16E-05
-2.63E-05
3.12E-06
1.01E-04
5.16E-05
1.42E-05
5.27E-05
1.43E-05
5.65E-05
8.39E-05
2.91E-05
2.61E-05
70
1.57E-05
-6.58E-05
-4.59E-05
3.81E-05
6.39E-06
-4.84E-06
4.84E-05
2.32E-07
3.13E-05
6.66E-05
2.75E-05
2.57E-05
9.81E-06
4.93E-05
1.45E-04
-1.25E-04
2.71E-06
4.92E-05
1.38E-04
-1.32E-04
1.07E-05
4.72E-05
1.40E-04
-1.19E-04
1.93E-05
4.84E-05
1.52E-04
-1.13E-04
3.68E-05
4.71E-05
1.66E-04
-9.24E-05
3.62E-05
4.91E-05
1.71E-04
-9.85E-05
-1.03E-05
4.37E-05
1.10E-04
-1.30E-04
4.35E-05
3.04E-05
1.27E-04
-3.98E-05
-3.50E-04
PASS
3.50E-04
PASS
3.56E-05
3.04E-05
1.19E-04
-4.79E-05
-3.50E-04
PASS
3.50E-04
PASS
3.59E-05
3.05E-05
1.19E-04
-4.77E-05
-3.50E-04
PASS
3.50E-04
PASS
3.68E-05
2.96E-05
1.18E-04
-4.45E-05
-5.00E-04
PASS
5.00E-04
PASS
4.19E-05
2.93E-05
1.22E-04
-3.84E-05
-6.50E-04
PASS
6.50E-04
PASS
4.43E-05
2.99E-05
1.26E-04
-3.78E-05
-6.50E-04
PASS
6.50E-04
PASS
2.83E-05
3.07E-05
1.12E-04
-5.58E-05
-6.50E-04
PASS
6.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
77
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 2 @ +15V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.36. Plot of Input Offset Voltage 2 @ +15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
78
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.36. Raw data for Input Offset Voltage 2 @ +15V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 2 @ +15V (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.18E-05
3.73E-06
4.54E-05
1.85E-05
4.18E-05
2.99E-05
6.98E-05
4.95E-05
-7.59E-05
4.05E-05
-5.75E-05
7.78E-05
10
7.53E-05
-5.07E-06
3.71E-05
7.73E-06
3.71E-05
2.33E-05
6.24E-05
4.38E-05
-8.59E-05
3.63E-05
-5.71E-05
7.97E-05
20
7.84E-05
5.79E-06
4.49E-05
1.63E-05
4.30E-05
2.35E-05
5.84E-05
4.59E-05
-8.57E-05
3.15E-05
-5.38E-05
7.55E-05
30
8.77E-05
1.18E-05
5.66E-05
2.22E-05
5.12E-05
2.93E-05
6.02E-05
4.79E-05
-8.02E-05
3.62E-05
-5.53E-05
8.15E-05
50
1.03E-04
3.27E-05
7.99E-05
4.38E-05
7.31E-05
3.26E-05
6.35E-05
5.42E-05
-6.69E-05
4.25E-05
-5.87E-05
8.13E-05
60
9.91E-05
2.85E-05
7.71E-05
4.33E-05
7.19E-05
3.60E-05
6.72E-05
5.65E-05
-6.41E-05
4.71E-05
-5.63E-05
7.92E-05
70
5.30E-05
-3.07E-05
2.37E-05
-8.22E-06
1.99E-05
2.39E-05
5.77E-05
4.15E-05
-9.30E-05
2.38E-05
-5.59E-05
8.01E-05
3.82E-05
2.98E-05
1.20E-04
-4.34E-05
3.04E-05
3.11E-05
1.16E-04
-5.50E-05
3.77E-05
2.83E-05
1.15E-04
-4.00E-05
4.59E-05
3.01E-05
1.28E-04
-3.65E-05
6.66E-05
2.84E-05
1.45E-04
-1.14E-05
6.40E-05
2.81E-05
1.41E-04
-1.30E-05
1.15E-05
3.20E-05
9.94E-05
-7.63E-05
2.28E-05
5.71E-05
1.79E-04
-1.34E-04
-3.50E-04
PASS
3.50E-04
PASS
1.60E-05
5.87E-05
1.77E-04
-1.45E-04
-3.50E-04
PASS
3.50E-04
PASS
1.47E-05
5.77E-05
1.73E-04
-1.44E-04
-3.50E-04
PASS
3.50E-04
PASS
1.87E-05
5.65E-05
1.74E-04
-1.36E-04
-5.00E-04
PASS
5.00E-04
PASS
2.52E-05
5.28E-05
1.70E-04
-1.20E-04
-6.50E-04
PASS
6.50E-04
PASS
2.85E-05
5.30E-05
1.74E-04
-1.17E-04
-6.50E-04
PASS
6.50E-04
PASS
1.08E-05
5.97E-05
1.74E-04
-1.53E-04
-6.50E-04
PASS
6.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
79
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 1 @ +15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.37. Plot of Input Offset Current 1 @ +15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.37. Raw data for Input Offset Current 1 @ +15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 1 @ +15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
0.00E+00
-1.10E-10
-8.00E-11
4.00E-11
-5.00E-11
-1.00E-10
-8.00E-11
-1.00E-10
-1.10E-10
-1.70E-10
-1.80E-10
-2.00E-11
10
-5.00E-11
-3.00E-11
-3.00E-11
3.00E-11
-1.40E-10
-9.00E-11
-3.00E-11
-3.00E-11
0.00E+00
-8.00E-11
-1.00E-10
-5.00E-11
20
-1.00E-10
1.30E-10
-2.70E-10
-3.00E-11
-1.40E-10
0.00E+00
-5.00E-11
-9.00E-11
-1.60E-10
-1.30E-10
-1.30E-10
0.00E+00
30
-1.60E-10
-3.00E-11
-2.00E-10
-5.00E-11
-1.10E-10
-1.50E-10
-1.10E-10
0.00E+00
-1.10E-10
-3.00E-11
-1.00E-10
-7.00E-11
50
-8.00E-11
-5.00E-11
-2.20E-10
-4.00E-11
-1.00E-10
-3.00E-11
9.00E-11
-1.00E-11
-3.10E-10
8.00E-11
-9.00E-11
-6.00E-11
60
-1.00E-10
-1.00E-11
-1.70E-10
-8.00E-11
-1.20E-10
-5.00E-11
1.60E-10
4.00E-11
-2.20E-10
-9.00E-11
-1.70E-10
-3.00E-11
70
-4.23E-09
-4.36E-09
-4.47E-09
-4.29E-09
-4.34E-09
-8.00E-11
-3.00E-11
-1.30E-10
-1.20E-10
4.00E-11
-1.40E-10
-1.00E-11
-4.00E-11
6.04E-11
1.26E-10
-2.06E-10
-4.40E-11
6.15E-11
1.25E-10
-2.13E-10
-8.20E-11
1.47E-10
3.22E-10
-4.86E-10
-1.10E-10
7.18E-11
8.68E-11
-3.07E-10
-9.80E-11
7.22E-11
1.00E-10
-2.96E-10
-9.60E-11
5.86E-11
6.46E-11
-2.57E-10
-4.34E-09
8.93E-11
-4.09E-09
-4.58E-09
-1.12E-10
3.42E-11
-1.82E-11
-2.06E-10
-8.00E-10
PASS
8.00E-10
PASS
-4.60E-11
3.78E-11
5.77E-11
-1.50E-10
-2.00E-09
PASS
2.00E-09
PASS
-8.60E-11
6.35E-11
8.81E-11
-2.60E-10
-2.00E-09
PASS
2.00E-09
PASS
-8.00E-11
6.24E-11
9.12E-11
-2.51E-10
-8.00E-09
PASS
8.00E-09
PASS
-3.60E-11
1.62E-10
4.09E-10
-4.81E-10
-1.30E-08
PASS
1.30E-08
PASS
-3.20E-11
1.42E-10
3.58E-10
-4.22E-10
-1.30E-08
PASS
1.30E-08
PASS
-6.40E-11
7.02E-11
1.29E-10
-2.57E-10
-1.30E-08
PASS
1.30E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
81
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 2 @ +15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.38. Plot of Input Offset Current 2 @ +15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
82
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.38. Raw data for Input Offset Current 2 @ +15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 2 @ +15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.70E-10
2.00E-11
-1.50E-10
-5.00E-11
-1.00E-10
2.00E-11
-2.20E-10
-4.00E-11
5.00E-11
-7.00E-11
-1.00E-11
-1.40E-10
10
0.00E+00
0.00E+00
-2.40E-10
-9.00E-11
-2.00E-11
8.00E-11
-4.00E-11
-6.00E-11
0.00E+00
-1.20E-10
-2.00E-11
-1.20E-10
20
3.00E-11
3.00E-11
-1.30E-10
1.30E-10
-5.00E-11
0.00E+00
-8.00E-11
0.00E+00
7.00E-11
0.00E+00
-3.00E-11
-1.90E-10
30
4.00E-11
3.00E-11
-8.00E-11
-1.00E-11
-2.00E-11
1.70E-10
6.00E-11
4.00E-11
1.70E-10
0.00E+00
-1.10E-10
-2.10E-10
50
-2.00E-11
1.60E-10
-2.90E-10
9.00E-11
-1.50E-10
2.10E-10
2.80E-10
8.00E-11
3.40E-10
1.10E-10
-1.00E-10
-1.90E-10
60
-6.00E-11
-1.00E-11
-4.50E-10
6.00E-11
-2.00E-10
4.50E-10
3.90E-10
1.40E-10
3.60E-10
4.70E-10
3.00E-11
-1.20E-10
70
-4.06E-09
-4.52E-09
-4.60E-09
-4.24E-09
-4.63E-09
-6.00E-11
9.00E-11
-5.00E-11
1.20E-10
-9.00E-11
-2.00E-11
-2.20E-10
-9.00E-11
7.71E-11
1.22E-10
-3.02E-10
-7.00E-11
1.02E-10
2.10E-10
-3.50E-10
2.00E-12
9.76E-11
2.70E-10
-2.66E-10
-8.00E-12
4.76E-11
1.23E-10
-1.39E-10
-4.20E-11
1.82E-10
4.56E-10
-5.40E-10
-1.32E-10
2.02E-10
4.21E-10
-6.85E-10
-4.41E-09
2.49E-10
-3.73E-09
-5.09E-09
-5.20E-11
1.05E-10
2.36E-10
-3.40E-10
-8.00E-10
PASS
8.00E-10
PASS
-2.80E-11
7.43E-11
1.76E-10
-2.32E-10
-2.00E-09
PASS
2.00E-09
PASS
-2.00E-12
5.31E-11
1.44E-10
-1.48E-10
-2.00E-09
PASS
2.00E-09
PASS
8.80E-11
7.79E-11
3.02E-10
-1.26E-10
-8.00E-09
PASS
8.00E-09
PASS
2.04E-10
1.10E-10
5.06E-10
-9.80E-11
-1.30E-08
PASS
1.30E-08
PASS
3.62E-10
1.32E-10
7.23E-10
6.17E-13
-1.30E-08
PASS
1.30E-08
PASS
2.00E-12
9.58E-11
2.65E-10
-2.61E-10
-1.30E-08
PASS
1.30E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
83
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 1 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.39. Plot of Positive Input Bias Current 1 @ +15V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
84
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.39. Raw data for Positive Input Bias Current 1 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 1 @ +15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.12E-09
9.07E-09
8.50E-09
8.92E-09
8.65E-09
8.49E-09
9.13E-09
9.08E-09
8.66E-09
8.98E-09
8.95E-09
8.65E-09
10
1.05E-08
1.15E-08
1.07E-08
1.10E-08
1.10E-08
1.03E-08
1.12E-08
1.10E-08
1.04E-08
1.08E-08
8.93E-09
8.67E-09
20
1.37E-08
1.49E-08
1.39E-08
1.42E-08
1.41E-08
1.25E-08
1.38E-08
1.33E-08
1.28E-08
1.32E-08
8.90E-09
8.66E-09
30
1.66E-08
1.80E-08
1.70E-08
1.73E-08
1.72E-08
1.47E-08
1.60E-08
1.54E-08
1.47E-08
1.53E-08
8.88E-09
8.60E-09
50
2.34E-08
2.52E-08
2.36E-08
2.39E-08
2.40E-08
1.91E-08
2.10E-08
2.01E-08
1.93E-08
2.01E-08
8.88E-09
8.67E-09
60
2.33E-08
2.51E-08
2.37E-08
2.41E-08
2.41E-08
1.88E-08
2.08E-08
1.99E-08
1.92E-08
1.99E-08
8.98E-09
8.68E-09
70
1.77E-08
1.96E-08
1.83E-08
1.85E-08
1.86E-08
1.67E-08
1.84E-08
1.77E-08
1.71E-08
1.78E-08
8.94E-09
8.63E-09
8.65E-09
3.72E-10
9.67E-09
7.63E-09
1.09E-08
3.72E-10
1.20E-08
9.92E-09
1.41E-08
4.64E-10
1.54E-08
1.29E-08
1.72E-08
5.24E-10
1.86E-08
1.58E-08
2.40E-08
6.82E-10
2.59E-08
2.22E-08
2.41E-08
6.71E-10
2.59E-08
2.22E-08
1.85E-08
6.87E-10
2.04E-08
1.67E-08
8.87E-09
2.79E-10
9.63E-09
8.10E-09
-1.50E-08
PASS
1.50E-08
PASS
1.08E-08
3.87E-10
1.18E-08
9.69E-09
-2.00E-08
PASS
2.00E-08
PASS
1.31E-08
4.89E-10
1.44E-08
1.18E-08
-2.00E-08
PASS
2.00E-08
PASS
1.52E-08
5.32E-10
1.67E-08
1.37E-08
-4.00E-08
PASS
4.00E-08
PASS
1.99E-08
7.52E-10
2.20E-08
1.79E-08
-8.00E-08
PASS
8.00E-08
PASS
1.97E-08
7.68E-10
2.18E-08
1.76E-08
-8.00E-08
PASS
8.00E-08
PASS
1.75E-08
6.80E-10
1.94E-08
1.57E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
85
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 2 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.40. Plot of Positive Input Bias Current 2 @ +15V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.40. Raw data for Positive Input Bias Current 2 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 2 @ +15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.26E-09
9.21E-09
8.59E-09
8.93E-09
8.79E-09
8.61E-09
9.18E-09
9.01E-09
9.12E-09
9.01E-09
8.97E-09
8.69E-09
10
1.06E-08
1.15E-08
1.07E-08
1.11E-08
1.11E-08
1.04E-08
1.11E-08
1.07E-08
1.10E-08
1.08E-08
8.98E-09
8.67E-09
20
1.40E-08
1.50E-08
1.40E-08
1.43E-08
1.43E-08
1.25E-08
1.36E-08
1.32E-08
1.34E-08
1.33E-08
9.00E-09
8.75E-09
30
1.71E-08
1.82E-08
1.71E-08
1.74E-08
1.75E-08
1.47E-08
1.58E-08
1.53E-08
1.56E-08
1.55E-08
8.94E-09
8.63E-09
50
2.39E-08
2.54E-08
2.36E-08
2.41E-08
2.43E-08
1.93E-08
2.08E-08
1.99E-08
2.04E-08
2.03E-08
8.96E-09
8.68E-09
60
2.40E-08
2.52E-08
2.36E-08
2.42E-08
2.43E-08
1.93E-08
2.09E-08
2.00E-08
2.04E-08
2.04E-08
9.07E-09
8.75E-09
70
1.81E-08
1.98E-08
1.82E-08
1.87E-08
1.88E-08
1.68E-08
1.83E-08
1.75E-08
1.79E-08
1.78E-08
9.04E-09
8.65E-09
8.76E-09
3.57E-10
9.74E-09
7.78E-09
1.10E-08
3.77E-10
1.20E-08
9.97E-09
1.43E-08
4.23E-10
1.55E-08
1.32E-08
1.74E-08
4.68E-10
1.87E-08
1.62E-08
2.42E-08
6.86E-10
2.61E-08
2.24E-08
2.42E-08
5.92E-10
2.59E-08
2.26E-08
1.87E-08
6.81E-10
2.06E-08
1.69E-08
8.99E-09
2.23E-10
9.60E-09
8.38E-09
-1.50E-08
PASS
1.50E-08
PASS
1.08E-08
2.70E-10
1.15E-08
1.01E-08
-2.00E-08
PASS
2.00E-08
PASS
1.32E-08
4.10E-10
1.43E-08
1.21E-08
-2.00E-08
PASS
2.00E-08
PASS
1.54E-08
4.35E-10
1.66E-08
1.42E-08
-4.00E-08
PASS
4.00E-08
PASS
2.01E-08
5.62E-10
2.17E-08
1.86E-08
-8.00E-08
PASS
8.00E-08
PASS
2.02E-08
5.94E-10
2.18E-08
1.85E-08
-8.00E-08
PASS
8.00E-08
PASS
1.76E-08
5.49E-10
1.92E-08
1.61E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
87
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 1 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.41. Plot of Negative Input Bias Current 1 @ +15V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.41. Raw data for Negative Input Bias Current 1 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 1 @ +15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.33E-09
9.12E-09
8.68E-09
8.83E-09
8.80E-09
8.54E-09
9.29E-09
9.14E-09
8.71E-09
9.16E-09
9.03E-09
8.65E-09
10
1.06E-08
1.16E-08
1.10E-08
1.10E-08
1.10E-08
1.03E-08
1.12E-08
1.11E-08
1.05E-08
1.10E-08
8.97E-09
8.70E-09
20
1.38E-08
1.48E-08
1.40E-08
1.42E-08
1.43E-08
1.27E-08
1.38E-08
1.33E-08
1.28E-08
1.33E-08
9.03E-09
8.68E-09
30
1.69E-08
1.82E-08
1.71E-08
1.74E-08
1.73E-08
1.46E-08
1.61E-08
1.55E-08
1.50E-08
1.54E-08
9.06E-09
8.74E-09
50
2.36E-08
2.52E-08
2.38E-08
2.41E-08
2.42E-08
1.92E-08
2.10E-08
2.03E-08
1.95E-08
2.01E-08
9.05E-09
8.74E-09
60
2.36E-08
2.54E-08
2.39E-08
2.41E-08
2.42E-08
1.89E-08
2.06E-08
2.00E-08
1.94E-08
1.98E-08
9.04E-09
8.71E-09
70
2.19E-08
2.41E-08
2.29E-08
2.30E-08
2.31E-08
1.69E-08
1.82E-08
1.78E-08
1.72E-08
1.78E-08
9.00E-09
8.64E-09
8.75E-09
2.86E-10
9.54E-09
7.97E-09
1.10E-08
3.79E-10
1.21E-08
9.98E-09
1.42E-08
3.70E-10
1.52E-08
1.32E-08
1.74E-08
5.14E-10
1.88E-08
1.60E-08
2.42E-08
5.91E-10
2.58E-08
2.25E-08
2.43E-08
6.55E-10
2.60E-08
2.25E-08
2.30E-08
7.81E-10
2.52E-08
2.09E-08
8.97E-09
3.24E-10
9.86E-09
8.08E-09
-1.50E-08
PASS
1.50E-08
PASS
1.08E-08
3.94E-10
1.19E-08
9.74E-09
-2.00E-08
PASS
2.00E-08
PASS
1.32E-08
4.52E-10
1.44E-08
1.19E-08
-2.00E-08
PASS
2.00E-08
PASS
1.53E-08
5.65E-10
1.69E-08
1.38E-08
-4.00E-08
PASS
4.00E-08
PASS
2.00E-08
6.88E-10
2.19E-08
1.81E-08
-8.00E-08
PASS
8.00E-08
PASS
1.97E-08
6.47E-10
2.15E-08
1.80E-08
-8.00E-08
PASS
8.00E-08
PASS
1.76E-08
5.59E-10
1.91E-08
1.60E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
89
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 2 @ +15V (A)
1.00E-07
8.00E-08
6.00E-08
4.00E-08
2.00E-08
v
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
-1.00E-07
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.42. Plot of Negative Input Bias Current 2 @ +15V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.42. Raw data for Negative Input Bias Current 2 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 2 @ +15V (A)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
8.42E-09
9.25E-09
8.63E-09
8.96E-09
8.88E-09
8.50E-09
9.30E-09
9.06E-09
9.12E-09
9.07E-09
8.97E-09
8.93E-09
10
1.07E-08
1.16E-08
1.09E-08
1.12E-08
1.12E-08
1.03E-08
1.12E-08
1.08E-08
1.10E-08
1.10E-08
8.96E-09
8.85E-09
20
1.41E-08
1.49E-08
1.41E-08
1.44E-08
1.44E-08
1.26E-08
1.37E-08
1.32E-08
1.33E-08
1.34E-08
9.01E-09
8.87E-09
30
1.71E-08
1.81E-08
1.72E-08
1.74E-08
1.76E-08
1.46E-08
1.57E-08
1.53E-08
1.54E-08
1.55E-08
8.98E-09
8.84E-09
50
2.40E-08
2.54E-08
2.40E-08
2.40E-08
2.45E-08
1.90E-08
2.06E-08
1.99E-08
2.02E-08
2.02E-08
9.09E-09
8.97E-09
60
2.39E-08
2.53E-08
2.40E-08
2.42E-08
2.46E-08
1.88E-08
2.04E-08
1.98E-08
1.99E-08
2.01E-08
9.12E-09
8.99E-09
70
2.24E-08
2.43E-08
2.28E-08
2.29E-08
2.35E-08
1.68E-08
1.82E-08
1.76E-08
1.79E-08
1.80E-08
8.96E-09
8.92E-09
8.83E-09
3.18E-10
9.70E-09
7.96E-09
1.11E-08
3.42E-10
1.20E-08
1.02E-08
1.44E-08
3.41E-10
1.53E-08
1.34E-08
1.75E-08
4.09E-10
1.86E-08
1.63E-08
2.44E-08
6.00E-10
2.60E-08
2.27E-08
2.44E-08
5.57E-10
2.59E-08
2.29E-08
2.32E-08
7.30E-10
2.52E-08
2.12E-08
9.01E-09
3.01E-10
9.84E-09
8.18E-09
-1.50E-08
PASS
1.50E-08
PASS
1.09E-08
3.33E-10
1.18E-08
9.95E-09
-2.00E-08
PASS
2.00E-08
PASS
1.32E-08
4.13E-10
1.44E-08
1.21E-08
-2.00E-08
PASS
2.00E-08
PASS
1.53E-08
4.20E-10
1.65E-08
1.42E-08
-4.00E-08
PASS
4.00E-08
PASS
2.00E-08
5.92E-10
2.16E-08
1.83E-08
-8.00E-08
PASS
8.00E-08
PASS
1.98E-08
6.09E-10
2.15E-08
1.81E-08
-8.00E-08
PASS
8.00E-08
PASS
1.77E-08
5.21E-10
1.91E-08
1.63E-08
-8.00E-08
PASS
8.00E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
91
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio 1 @ +15V (dB)
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.43. Plot of Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.43. Raw data for Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 1 @ +15V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.09E+02
1.14E+02
1.10E+02
1.07E+02
1.10E+02
1.09E+02
1.11E+02
1.07E+02
1.14E+02
1.08E+02
1.08E+02
1.10E+02
10
1.08E+02
1.12E+02
1.09E+02
1.07E+02
1.09E+02
1.08E+02
1.10E+02
1.07E+02
1.12E+02
1.07E+02
1.08E+02
1.10E+02
20
1.08E+02
1.12E+02
1.09E+02
1.06E+02
1.09E+02
1.08E+02
1.09E+02
1.07E+02
1.11E+02
1.07E+02
1.08E+02
1.10E+02
30
1.08E+02
1.12E+02
1.09E+02
1.06E+02
1.09E+02
1.07E+02
1.09E+02
1.06E+02
1.11E+02
1.06E+02
1.08E+02
1.10E+02
50
1.08E+02
1.12E+02
1.09E+02
1.06E+02
1.09E+02
1.07E+02
1.08E+02
1.06E+02
1.10E+02
1.06E+02
1.08E+02
1.10E+02
60
1.08E+02
1.12E+02
1.09E+02
1.06E+02
1.09E+02
1.07E+02
1.08E+02
1.06E+02
1.11E+02
1.06E+02
1.08E+02
1.10E+02
70
1.08E+02
1.13E+02
1.10E+02
1.07E+02
1.09E+02
1.08E+02
1.09E+02
1.07E+02
1.11E+02
1.07E+02
1.08E+02
1.10E+02
1.10E+02
2.42E+00
1.17E+02
1.03E+02
1.09E+02
1.94E+00
1.14E+02
1.04E+02
1.09E+02
2.10E+00
1.15E+02
1.03E+02
1.09E+02
2.18E+00
1.15E+02
1.03E+02
1.09E+02
2.00E+00
1.14E+02
1.03E+02
1.09E+02
2.01E+00
1.14E+02
1.03E+02
1.09E+02
2.28E+00
1.16E+02
1.03E+02
1.10E+02
2.49E+00
1.16E+02
1.03E+02
9.70E+01
PASS
1.09E+02
2.11E+00
1.14E+02
1.03E+02
9.40E+01
PASS
1.08E+02
1.93E+00
1.14E+02
1.03E+02
9.40E+01
PASS
1.08E+02
1.84E+00
1.13E+02
1.03E+02
9.20E+01
PASS
1.08E+02
1.62E+00
1.12E+02
1.03E+02
9.00E+01
PASS
1.08E+02
2.20E+00
1.14E+02
1.02E+02
9.00E+01
PASS
1.08E+02
1.94E+00
1.14E+02
1.03E+02
9.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
93
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio 2 @ +15V (dB)
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.44. Plot of Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
94
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.44. Raw data for Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 2 @ +15V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.07E+02
1.11E+02
1.09E+02
1.09E+02
1.10E+02
1.12E+02
1.10E+02
1.08E+02
1.07E+02
1.08E+02
1.11E+02
1.08E+02
10
1.07E+02
1.11E+02
1.08E+02
1.08E+02
1.09E+02
1.10E+02
1.08E+02
1.08E+02
1.06E+02
1.07E+02
1.12E+02
1.09E+02
20
1.07E+02
1.10E+02
1.08E+02
1.08E+02
1.09E+02
1.10E+02
1.08E+02
1.07E+02
1.06E+02
1.07E+02
1.11E+02
1.09E+02
30
1.07E+02
1.10E+02
1.08E+02
1.08E+02
1.09E+02
1.09E+02
1.07E+02
1.06E+02
1.06E+02
1.06E+02
1.11E+02
1.09E+02
50
1.06E+02
1.10E+02
1.08E+02
1.08E+02
1.09E+02
1.09E+02
1.08E+02
1.06E+02
1.06E+02
1.07E+02
1.11E+02
1.09E+02
60
1.07E+02
1.10E+02
1.08E+02
1.08E+02
1.09E+02
1.09E+02
1.07E+02
1.07E+02
1.06E+02
1.06E+02
1.11E+02
1.09E+02
70
1.06E+02
1.11E+02
1.08E+02
1.08E+02
1.09E+02
1.10E+02
1.08E+02
1.07E+02
1.06E+02
1.07E+02
1.12E+02
1.09E+02
1.09E+02
1.47E+00
1.14E+02
1.05E+02
1.09E+02
1.40E+00
1.12E+02
1.05E+02
1.08E+02
1.36E+00
1.12E+02
1.05E+02
1.08E+02
1.36E+00
1.12E+02
1.05E+02
1.08E+02
1.16E+00
1.11E+02
1.05E+02
1.08E+02
1.39E+00
1.12E+02
1.05E+02
1.09E+02
1.63E+00
1.13E+02
1.04E+02
1.09E+02
1.73E+00
1.14E+02
1.04E+02
9.70E+01
PASS
1.08E+02
1.31E+00
1.11E+02
1.04E+02
9.40E+01
PASS
1.07E+02
1.43E+00
1.11E+02
1.04E+02
9.40E+01
PASS
1.07E+02
1.35E+00
1.11E+02
1.03E+02
9.20E+01
PASS
1.07E+02
1.29E+00
1.10E+02
1.03E+02
9.00E+01
PASS
1.07E+02
1.21E+00
1.10E+02
1.04E+02
9.00E+01
PASS
1.08E+02
1.44E+00
1.12E+02
1.04E+02
9.00E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
95
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 1 @ +15V (dB)
1.50E+02
1.40E+02
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.45. Plot of Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
96
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.45. Raw data for Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 1 @ +15V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.32E+02
1.46E+02
1.27E+02
1.26E+02
1.59E+02
1.61E+02
1.30E+02
1.35E+02
1.25E+02
1.41E+02
1.29E+02
1.39E+02
10
1.48E+02
1.40E+02
1.40E+02
1.28E+02
1.29E+02
1.40E+02
1.32E+02
1.34E+02
1.23E+02
1.52E+02
1.25E+02
1.32E+02
20
1.32E+02
1.42E+02
1.60E+02
1.23E+02
1.39E+02
1.60E+02
1.26E+02
1.31E+02
1.28E+02
1.47E+02
1.31E+02
1.50E+02
30
1.45E+02
1.37E+02
1.26E+02
1.27E+02
1.40E+02
1.40E+02
1.29E+02
1.39E+02
1.22E+02
1.30E+02
1.25E+02
1.37E+02
50
1.47E+02
1.48E+02
1.39E+02
1.26E+02
1.45E+02
1.28E+02
1.33E+02
1.38E+02
1.22E+02
1.31E+02
1.25E+02
1.32E+02
60
1.35E+02
1.42E+02
1.37E+02
1.24E+02
1.49E+02
1.36E+02
1.28E+02
1.35E+02
1.21E+02
1.38E+02
1.28E+02
1.30E+02
70
1.30E+02
1.52E+02
1.37E+02
1.39E+02
1.27E+02
1.59E+02
1.25E+02
1.28E+02
1.26E+02
1.41E+02
1.29E+02
1.26E+02
1.38E+02
1.42E+01
1.77E+02
9.92E+01
1.37E+02
8.41E+00
1.60E+02
1.14E+02
1.39E+02
1.40E+01
1.78E+02
1.01E+02
1.35E+02
8.16E+00
1.57E+02
1.12E+02
1.41E+02
9.10E+00
1.66E+02
1.16E+02
1.37E+02
9.20E+00
1.63E+02
1.12E+02
1.37E+02
9.83E+00
1.64E+02
1.10E+02
1.38E+02
1.37E+01
1.76E+02
1.01E+02
1.00E+02
PASS
1.36E+02
1.08E+01
1.66E+02
1.06E+02
1.00E+02
PASS
1.38E+02
1.46E+01
1.78E+02
9.84E+01
1.00E+02
PASS
1.32E+02
7.34E+00
1.52E+02
1.12E+02
1.00E+02
PASS
1.30E+02
5.87E+00
1.46E+02
1.14E+02
9.80E+01
PASS
1.32E+02
7.07E+00
1.51E+02
1.12E+02
9.80E+01
PASS
1.36E+02
1.47E+01
1.76E+02
9.53E+01
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
97
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 2 @ +15V (dB)
1.50E+02
1.40E+02
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.46. Plot of Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
98
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.46. Raw data for Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 2 @ +15V (dB)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.25E+02
1.32E+02
1.33E+02
1.27E+02
1.27E+02
1.39E+02
1.97E+02
1.26E+02
1.19E+02
1.42E+02
1.24E+02
1.35E+02
10
1.22E+02
1.30E+02
1.25E+02
1.24E+02
1.25E+02
1.29E+02
1.33E+02
1.23E+02
1.20E+02
1.27E+02
1.27E+02
1.26E+02
20
1.25E+02
1.35E+02
1.24E+02
1.23E+02
1.27E+02
1.30E+02
1.30E+02
1.21E+02
1.18E+02
1.25E+02
1.27E+02
1.40E+02
30
1.24E+02
1.31E+02
1.29E+02
1.21E+02
1.25E+02
1.31E+02
1.26E+02
1.21E+02
1.20E+02
1.36E+02
1.29E+02
1.38E+02
50
1.21E+02
1.26E+02
1.28E+02
1.21E+02
1.23E+02
1.32E+02
1.31E+02
1.22E+02
1.21E+02
1.29E+02
1.28E+02
1.25E+02
60
1.24E+02
1.32E+02
1.28E+02
1.22E+02
1.21E+02
1.23E+02
1.33E+02
1.22E+02
1.21E+02
1.34E+02
1.29E+02
1.28E+02
70
1.27E+02
1.52E+02
1.50E+02
1.24E+02
1.29E+02
1.27E+02
1.30E+02
1.24E+02
1.21E+02
1.51E+02
1.26E+02
1.27E+02
1.29E+02
3.43E+00
1.38E+02
1.19E+02
1.25E+02
3.13E+00
1.34E+02
1.16E+02
1.27E+02
4.72E+00
1.40E+02
1.14E+02
1.26E+02
3.86E+00
1.36E+02
1.15E+02
1.24E+02
3.03E+00
1.32E+02
1.15E+02
1.26E+02
4.64E+00
1.38E+02
1.13E+02
1.37E+02
1.34E+01
1.73E+02
9.98E+01
1.44E+02
3.09E+01
2.29E+02
5.97E+01
1.00E+02
PASS
1.26E+02
5.02E+00
1.40E+02
1.12E+02
1.00E+02
PASS
1.25E+02
5.47E+00
1.40E+02
1.10E+02
1.00E+02
PASS
1.27E+02
7.01E+00
1.46E+02
1.08E+02
1.00E+02
PASS
1.27E+02
5.09E+00
1.41E+02
1.13E+02
9.80E+01
PASS
1.27E+02
6.41E+00
1.44E+02
1.09E+02
9.80E+01
PASS
1.31E+02
1.20E+01
1.64E+02
9.81E+01
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
99
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
4.00E+04
3.50E+04
3.00E+04
2.50E+04
2.00E+04
1.50E+04
1.00E+04
5.00E+03
0.00E+00
-5.00E+03
-1.00E+04
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.47. Plot of Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.47. Raw data for Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
3.71E+04
2.47E+04
3.21E+04
2.60E+04
2.13E+04
3.78E+04
3.12E+04
3.29E+04
2.54E+04
2.44E+04
2.93E+04
2.55E+04
10
3.02E+04
4.06E+04
2.43E+04
3.19E+04
3.23E+04
4.15E+04
3.62E+04
4.30E+04
3.00E+04
3.12E+04
1.76E+04
3.09E+04
20
3.54E+04
4.43E+04
2.40E+04
5.22E+04
2.31E+04
4.07E+04
2.61E+04
2.38E+04
3.57E+04
3.05E+04
2.87E+04
3.36E+04
30
1.82E+04
3.16E+04
3.22E+04
2.62E+04
2.62E+04
2.03E+04
3.12E+04
2.19E+04
2.37E+04
2.49E+04
2.51E+04
4.34E+04
50
3.21E+04
2.88E+04
4.73E+04
3.65E+04
2.49E+04
2.84E+04
4.14E+04
1.83E+04
2.28E+04
1.48E+04
1.32E+04
2.78E+04
60
2.93E+04
3.06E+04
3.06E+04
3.30E+04
3.80E+04
3.23E+04
1.46E+04
2.56E+04
1.97E+04
3.73E+04
2.97E+04
2.61E+04
70
3.31E+04
2.26E+04
2.57E+04
3.76E+04
2.05E+04
2.82E+04
3.58E+04
3.85E+04
2.07E+04
3.57E+04
2.12E+04
2.01E+04
2.82E+04
6.33E+03
4.56E+04
1.09E+04
3.19E+04
5.82E+03
4.78E+04
1.59E+04
3.58E+04
1.27E+04
7.06E+04
1.10E+03
2.69E+04
5.65E+03
4.24E+04
1.14E+04
3.39E+04
8.62E+03
5.76E+04
1.03E+04
3.23E+04
3.43E+03
4.17E+04
2.29E+04
2.79E+04
7.22E+03
4.77E+04
8.11E+03
3.04E+04
5.51E+03
4.55E+04
1.52E+04
1.00E+03
PASS
3.64E+04
5.88E+03
5.25E+04
2.03E+04
1.00E+03
PASS
3.14E+04
6.93E+03
5.04E+04
1.24E+04
1.00E+03
PASS
2.44E+04
4.20E+03
3.59E+04
1.29E+04
7.00E+02
PASS
2.51E+04
1.04E+04
5.38E+04
-3.52E+03
4.00E+02
PASS
2.59E+04
9.17E+03
5.10E+04
7.35E+02
4.00E+02
PASS
3.18E+04
7.29E+03
5.18E+04
1.18E+04
4.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
101
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
4.00E+04
3.50E+04
3.00E+04
2.50E+04
2.00E+04
1.50E+04
1.00E+04
5.00E+03
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.48. Plot of Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.48. Raw data for Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.10E+04
3.20E+04
3.60E+04
3.44E+04
3.11E+04
2.96E+04
3.29E+04
2.51E+04
3.34E+04
4.52E+04
4.11E+04
2.73E+04
10
2.56E+04
3.38E+04
3.57E+04
2.94E+04
3.10E+04
4.38E+04
3.62E+04
3.16E+04
3.45E+04
3.53E+04
2.94E+04
3.69E+04
20
4.27E+04
3.78E+04
2.66E+04
3.28E+04
3.24E+04
4.95E+04
2.87E+04
3.09E+04
3.59E+04
3.40E+04
4.86E+04
2.66E+04
30
4.22E+04
3.95E+04
2.31E+04
2.68E+04
3.21E+04
3.13E+04
2.58E+04
2.64E+04
2.82E+04
2.61E+04
3.22E+04
3.54E+04
50
4.32E+04
3.79E+04
2.02E+04
3.07E+04
3.28E+04
3.19E+04
3.27E+04
3.85E+04
2.66E+04
3.54E+04
3.33E+04
4.18E+04
60
4.65E+04
3.31E+04
3.12E+04
4.28E+04
2.46E+04
3.73E+04
1.71E+04
2.32E+04
2.77E+04
3.27E+04
4.27E+04
1.87E+04
70
2.88E+04
4.72E+04
3.39E+04
2.81E+04
3.88E+04
3.46E+04
2.85E+04
2.94E+04
3.43E+04
3.46E+04
4.31E+04
3.55E+04
3.49E+04
3.95E+03
4.57E+04
2.41E+04
3.11E+04
3.91E+03
4.18E+04
2.04E+04
3.45E+04
6.09E+03
5.12E+04
1.78E+04
3.27E+04
8.14E+03
5.51E+04
1.04E+04
3.30E+04
8.62E+03
5.66E+04
9.31E+03
3.57E+04
8.89E+03
6.00E+04
1.13E+04
3.54E+04
7.92E+03
5.71E+04
1.36E+04
3.32E+04
7.46E+03
5.37E+04
1.28E+04
1.00E+03
PASS
3.63E+04
4.56E+03
4.88E+04
2.38E+04
1.00E+03
PASS
3.58E+04
8.15E+03
5.82E+04
1.34E+04
1.00E+03
PASS
2.75E+04
2.28E+03
3.38E+04
2.13E+04
7.00E+02
PASS
3.30E+04
4.43E+03
4.52E+04
2.09E+04
4.00E+02
PASS
2.76E+04
7.89E+03
4.92E+04
5.95E+03
4.00E+02
PASS
3.23E+04
3.07E+03
4.07E+04
2.39E+04
4.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
103
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.49. Plot of Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
104
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.49. Raw data for Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.87E+03
1.46E+03
1.68E+03
1.77E+03
1.77E+03
1.80E+03
1.81E+03
1.88E+03
1.43E+03
2.02E+03
2.32E+03
1.68E+03
10
1.71E+03
1.37E+03
1.50E+03
1.55E+03
1.63E+03
1.58E+03
1.67E+03
1.74E+03
1.27E+03
1.77E+03
2.16E+03
1.63E+03
20
1.63E+03
1.29E+03
1.39E+03
1.47E+03
1.57E+03
1.49E+03
1.64E+03
1.73E+03
1.25E+03
1.66E+03
2.16E+03
1.64E+03
30
1.55E+03
1.16E+03
1.23E+03
1.31E+03
1.45E+03
1.37E+03
1.55E+03
1.45E+03
1.11E+03
1.49E+03
2.10E+03
1.64E+03
50
1.45E+03
9.65E+02
1.06E+03
1.13E+03
1.22E+03
1.13E+03
1.23E+03
1.22E+03
8.59E+02
1.31E+03
2.16E+03
1.55E+03
60
1.39E+03
9.58E+02
1.03E+03
1.16E+03
1.21E+03
1.16E+03
1.25E+03
1.22E+03
8.95E+02
1.27E+03
2.07E+03
1.52E+03
70
1.87E+03
1.25E+03
1.42E+03
1.53E+03
1.60E+03
1.47E+03
1.51E+03
1.61E+03
1.14E+03
1.66E+03
2.29E+03
1.69E+03
1.71E+03
1.53E+02
2.13E+03
1.29E+03
1.55E+03
1.29E+02
1.91E+03
1.20E+03
1.47E+03
1.35E+02
1.84E+03
1.10E+03
1.34E+03
1.56E+02
1.77E+03
9.12E+02
1.16E+03
1.85E+02
1.67E+03
6.55E+02
1.15E+03
1.70E+02
1.62E+03
6.83E+02
1.54E+03
2.32E+02
2.17E+03
9.00E+02
1.79E+03
2.17E+02
2.38E+03
1.19E+03
3.00E+02
PASS
1.61E+03
2.03E+02
2.16E+03
1.05E+03
3.00E+02
PASS
1.55E+03
1.92E+02
2.08E+03
1.03E+03
3.00E+02
PASS
1.39E+03
1.74E+02
1.87E+03
9.15E+02
2.00E+02
PASS
1.15E+03
1.74E+02
1.63E+03
6.73E+02
1.20E+02
PASS
1.16E+03
1.53E+02
1.58E+03
7.40E+02
1.20E+02
PASS
1.48E+03
2.06E+02
2.04E+03
9.13E+02
1.20E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
105
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.50. Plot of Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
106
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.50. Raw data for Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.34E+03
1.34E+03
1.46E+03
1.39E+03
1.39E+03
1.48E+03
1.43E+03
1.41E+03
1.39E+03
1.50E+03
1.47E+03
1.51E+03
10
1.25E+03
1.24E+03
1.33E+03
1.30E+03
1.23E+03
1.34E+03
1.30E+03
1.31E+03
1.31E+03
1.36E+03
1.37E+03
1.50E+03
20
1.22E+03
1.15E+03
1.26E+03
1.18E+03
1.19E+03
1.29E+03
1.29E+03
1.23E+03
1.21E+03
1.34E+03
1.41E+03
1.52E+03
30
1.18E+03
1.06E+03
1.13E+03
1.15E+03
1.09E+03
1.17E+03
1.20E+03
1.17E+03
1.10E+03
1.20E+03
1.44E+03
1.50E+03
50
1.05E+03
9.21E+02
9.79E+02
9.69E+02
9.18E+02
9.59E+02
1.10E+03
9.72E+02
9.34E+02
9.27E+02
1.37E+03
1.52E+03
60
1.05E+03
9.32E+02
9.55E+02
9.47E+02
9.02E+02
9.72E+02
1.04E+03
9.62E+02
9.46E+02
9.33E+02
1.33E+03
1.42E+03
70
1.24E+03
1.15E+03
1.24E+03
1.23E+03
1.14E+03
1.21E+03
1.28E+03
1.18E+03
1.15E+03
1.25E+03
1.36E+03
1.48E+03
1.39E+03
4.99E+01
1.52E+03
1.25E+03
1.27E+03
4.20E+01
1.39E+03
1.16E+03
1.20E+03
4.21E+01
1.32E+03
1.08E+03
1.12E+03
4.72E+01
1.25E+03
9.94E+02
9.66E+02
5.21E+01
1.11E+03
8.23E+02
9.58E+02
5.76E+01
1.12E+03
8.00E+02
1.20E+03
4.87E+01
1.33E+03
1.07E+03
1.44E+03
4.59E+01
1.57E+03
1.32E+03
3.00E+02
PASS
1.33E+03
2.47E+01
1.39E+03
1.26E+03
3.00E+02
PASS
1.27E+03
5.52E+01
1.42E+03
1.12E+03
3.00E+02
PASS
1.17E+03
4.12E+01
1.28E+03
1.06E+03
2.00E+02
PASS
9.79E+02
7.25E+01
1.18E+03
7.81E+02
1.20E+02
PASS
9.72E+02
4.32E+01
1.09E+03
8.53E+02
1.20E+02
PASS
1.21E+03
5.03E+01
1.35E+03
1.08E+03
1.20E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
107
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +15V RL=50kΩ (V)
1.44E+01
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.51. Plot of Output Voltage High 1 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.51. Raw data for Output Voltage High 1 @ +15V RL=50kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +15V RL=50kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
10
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
20
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
30
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
50
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
60
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
70
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
4.36E-03
1.43E+01
1.42E+01
1.42E+01
4.93E-03
1.43E+01
1.42E+01
1.42E+01
5.02E-03
1.43E+01
1.42E+01
1.42E+01
4.53E-03
1.43E+01
1.42E+01
1.42E+01
4.77E-03
1.43E+01
1.42E+01
1.42E+01
4.77E-03
1.43E+01
1.42E+01
1.42E+01
5.22E-03
1.43E+01
1.42E+01
1.42E+01
3.44E-03
1.42E+01
1.42E+01
1.30E+01
PASS
1.42E+01
3.03E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.42E+01
3.65E-03
1.42E+01
1.42E+01
1.30E+01
PASS
1.42E+01
3.96E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.42E+01
3.58E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.42E+01
3.63E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.42E+01
3.74E-03
1.43E+01
1.42E+01
1.30E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
109
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +15V RL=50kΩ (V)
1.44E+01
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.52. Plot of Output Voltage High 2 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.52. Raw data for Output Voltage High 2 @ +15V RL=50kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +15V RL=50kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
10
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
20
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
30
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
50
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
60
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
70
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
3.35E-03
1.43E+01
1.42E+01
1.43E+01
4.10E-03
1.43E+01
1.42E+01
1.43E+01
3.58E-03
1.43E+01
1.42E+01
1.43E+01
3.35E-03
1.43E+01
1.43E+01
1.43E+01
3.83E-03
1.43E+01
1.42E+01
1.43E+01
4.10E-03
1.43E+01
1.43E+01
1.43E+01
4.15E-03
1.43E+01
1.42E+01
1.43E+01
2.61E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.43E+01
2.19E-03
1.43E+01
1.43E+01
1.30E+01
PASS
1.43E+01
2.28E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.43E+01
2.61E-03
1.43E+01
1.43E+01
1.30E+01
PASS
1.43E+01
3.21E-03
1.43E+01
1.42E+01
1.30E+01
PASS
1.43E+01
2.51E-03
1.43E+01
1.43E+01
1.30E+01
PASS
1.43E+01
2.51E-03
1.43E+01
1.43E+01
1.30E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
111
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +15V RL=2kΩ (V)
1.35E+01
1.30E+01
1.25E+01
1.20E+01
1.15E+01
1.10E+01
1.05E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.53. Plot of Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.53. Raw data for Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +15V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
10
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
20
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
30
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
50
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
60
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
70
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.30E+01
1.30E+01
1.31E+01
1.30E+01
1.31E+01
2.19E-02
1.31E+01
1.30E+01
1.31E+01
2.21E-02
1.31E+01
1.30E+01
1.30E+01
2.21E-02
1.31E+01
1.30E+01
1.30E+01
2.26E-02
1.31E+01
1.30E+01
1.30E+01
2.32E-02
1.31E+01
1.30E+01
1.30E+01
2.30E-02
1.31E+01
1.30E+01
1.30E+01
2.29E-02
1.31E+01
1.30E+01
1.30E+01
1.72E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.30E+01
1.76E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.30E+01
1.72E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.30E+01
1.69E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.30E+01
1.72E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.30E+01
1.73E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.30E+01
1.77E-02
1.31E+01
1.30E+01
1.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
113
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +15V RL=2kΩ (V)
1.35E+01
1.30E+01
1.25E+01
1.20E+01
1.15E+01
1.10E+01
1.05E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.54. Plot of Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.54. Raw data for Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +15V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
10
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
20
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
30
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
50
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
60
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
70
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
1.31E+01
2.08E-02
1.32E+01
1.30E+01
1.31E+01
2.09E-02
1.32E+01
1.30E+01
1.31E+01
2.14E-02
1.31E+01
1.30E+01
1.31E+01
2.18E-02
1.32E+01
1.30E+01
1.31E+01
2.22E-02
1.31E+01
1.30E+01
1.31E+01
2.19E-02
1.31E+01
1.30E+01
1.31E+01
2.20E-02
1.32E+01
1.30E+01
1.31E+01
1.56E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.31E+01
1.55E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.31E+01
1.60E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.31E+01
1.62E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.31E+01
1.67E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.31E+01
1.65E-02
1.31E+01
1.30E+01
1.10E+01
PASS
1.31E+01
1.62E-02
1.31E+01
1.30E+01
1.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
115
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 1 @ +15V RL=50kΩ (V)
-1.28E+01
-1.30E+01
-1.32E+01
-1.34E+01
-1.36E+01
-1.38E+01
-1.40E+01
-1.42E+01
-1.44E+01
-1.46E+01
-1.48E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.55. Plot of Output Voltage Low 1 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.55. Raw data for Output Voltage Low 1 @ +15V RL=50kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +15V RL=50kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
10
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
20
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
30
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
50
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
24 hr
Anneal
168 hr
Anneal
60
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
70
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.46E+01 -1.45E+01
1.48E-03 1.95E-03 1.67E-03 1.64E-03 2.07E-03 1.52E-03 1.73E-03
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.46E+01 -1.45E+01
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.46E+01 -1.45E+01
-1.45E+01
1.10E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
-1.45E+01
1.30E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
-1.45E+01
1.48E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
-1.45E+01
8.37E-04
-1.45E+01
-1.45E+01
-1.30E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
117
-1.46E+01
1.30E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.46E+01
1.30E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.45E+01
1.52E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 2 @ +15V RL=50kΩ (V)
-1.28E+01
-1.30E+01
-1.32E+01
-1.34E+01
-1.36E+01
-1.38E+01
-1.40E+01
-1.42E+01
-1.44E+01
-1.46E+01
-1.48E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.56. Plot of Output Voltage Low 2 @ +15V RL=50kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.56. Raw data for Output Voltage Low 2 @ +15V RL=50kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +15V RL=50kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
10
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
20
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
30
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
50
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
24 hr
Anneal
168 hr
Anneal
60
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
70
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.46E+01 -1.45E+01
1.52E-03 1.41E-03 2.00E-03 1.52E-03 1.58E-03 1.30E-03 1.30E-03
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.46E+01 -1.45E+01
-1.45E+01 -1.45E+01 -1.45E+01 -1.45E+01 -1.46E+01 -1.46E+01 -1.45E+01
-1.45E+01
1.52E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
-1.45E+01
1.67E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
-1.45E+01
1.52E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
-1.45E+01
1.79E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
119
-1.46E+01
1.52E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.46E+01
1.67E-03
-1.46E+01
-1.46E+01
-1.30E+01
PASS
-1.45E+01
1.30E-03
-1.45E+01
-1.45E+01
-1.30E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 1 @ +15V RL=2kΩ (V)
-6.00E+00
-7.00E+00
-8.00E+00
-9.00E+00
-1.00E+01
-1.10E+01
-1.20E+01
-1.30E+01
-1.40E+01
-1.50E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.57. Plot of Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.57. Raw data for Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +15V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
10
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
20
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
30
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
50
-1.37E+01
-1.36E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.37E+01
-1.37E+01
24 hr
Anneal
168 hr
Anneal
60
-1.37E+01
-1.36E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.37E+01
-1.37E+01
70
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.37E+01 -1.36E+01
1.39E-02 1.44E-02 1.38E-02 1.48E-02 1.43E-02 1.43E-02 1.38E-02
-1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.37E+01 -1.36E+01
-1.36E+01
2.25E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
2.23E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
2.27E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
2.27E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
121
-1.36E+01
2.34E-02
-1.36E+01
-1.37E+01
-1.10E+01
PASS
-1.36E+01
2.34E-02
-1.36E+01
-1.37E+01
-1.10E+01
PASS
-1.36E+01
2.29E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Output Voltage Low 2 @ +15V RL=2kΩ (V)
-6.00E+00
-7.00E+00
-8.00E+00
-9.00E+00
-1.00E+01
-1.10E+01
-1.20E+01
-1.30E+01
-1.40E+01
-1.50E+01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.58. Plot of Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.58. Raw data for Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +15V RL=2kΩ (V)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
10
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
20
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
30
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
50
-1.37E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.36E+01
-1.37E+01
-1.36E+01
-1.37E+01
-1.37E+01
-1.37E+01
24 hr
Anneal
168 hr
Anneal
60
-1.37E+01
-1.36E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.37E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.37E+01
-1.37E+01
70
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.37E+01 -1.36E+01
1.48E-02 1.44E-02 1.49E-02 1.54E-02 1.53E-02 1.50E-02 1.41E-02
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.37E+01 -1.36E+01
-1.36E+01
2.01E-02
-1.35E+01
-1.37E+01
-1.10E+01
PASS
-1.36E+01
2.15E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
-1.36E+01
2.10E-02
-1.35E+01
-1.37E+01
-1.10E+01
PASS
-1.36E+01
2.05E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
123
-1.37E+01
2.11E-02
-1.36E+01
-1.37E+01
-1.10E+01
PASS
-1.37E+01
2.15E-02
-1.36E+01
-1.37E+01
-1.10E+01
PASS
-1.36E+01
2.13E-02
-1.35E+01
-1.36E+01
-1.10E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Slew Rate 1 @ +15V (V/us)
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.59. Plot of Positive Slew Rate 1 @ +15V (V/us) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.59. Raw data for Positive Slew Rate 1 @ +15V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 1 @ +15V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.22E-01
1.18E-01
1.16E-01
1.05E-01
1.20E-01
1.12E-01
1.21E-01
1.15E-01
1.13E-01
1.17E-01
1.22E-01
1.18E-01
10
1.20E-01
1.21E-01
1.13E-01
1.09E-01
1.04E-01
1.10E-01
1.14E-01
1.08E-01
1.09E-01
1.15E-01
1.20E-01
1.14E-01
20
1.20E-01
1.15E-01
1.17E-01
1.04E-01
1.17E-01
1.05E-01
1.14E-01
1.03E-01
1.05E-01
1.11E-01
1.19E-01
1.18E-01
30
1.15E-01
9.40E-02
1.12E-01
1.04E-01
1.15E-01
1.04E-01
1.18E-01
1.01E-01
1.07E-01
1.09E-01
1.13E-01
1.16E-01
50
1.13E-01
1.04E-01
1.06E-01
9.50E-02
9.70E-02
9.90E-02
1.10E-01
9.20E-02
1.06E-01
9.50E-02
1.20E-01
1.21E-01
60
1.17E-01
1.14E-01
1.03E-01
8.70E-02
9.80E-02
1.03E-01
1.12E-01
1.00E-01
1.08E-01
1.03E-01
1.18E-01
1.17E-01
70
1.13E-01
1.09E-01
1.11E-01
9.90E-02
1.09E-01
9.50E-02
1.13E-01
1.04E-01
9.30E-02
1.10E-01
1.23E-01
1.19E-01
1.16E-01
6.65E-03
1.34E-01
9.80E-02
1.13E-01
7.23E-03
1.33E-01
9.36E-02
1.15E-01
6.19E-03
1.32E-01
9.76E-02
1.08E-01
9.03E-03
1.33E-01
8.32E-02
1.03E-01
7.25E-03
1.23E-01
8.31E-02
1.04E-01
1.22E-02
1.37E-01
7.04E-02
1.08E-01
5.40E-03
1.23E-01
9.34E-02
1.16E-01
3.58E-03
1.25E-01
1.06E-01
6.00E-02
PASS
1.11E-01
3.11E-03
1.20E-01
1.03E-01
5.00E-02
PASS
1.08E-01
4.67E-03
1.20E-01
9.48E-02
5.00E-02
PASS
1.08E-01
6.46E-03
1.26E-01
9.01E-02
4.00E-02
PASS
1.00E-01
7.50E-03
1.21E-01
7.98E-02
3.00E-02
PASS
1.05E-01
4.76E-03
1.18E-01
9.21E-02
3.00E-02
PASS
1.03E-01
8.86E-03
1.27E-01
7.87E-02
3.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
125
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Positive Slew Rate 2 @ +15V (V/us)
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.60. Plot of Positive Slew Rate 2 @ +15V (V/us) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.60. Raw data for Positive Slew Rate 2 @ +15V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 2 @ +15V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.20E-01
1.00E-01
1.16E-01
1.07E-01
1.11E-01
1.07E-01
1.19E-01
1.12E-01
1.13E-01
1.18E-01
1.21E-01
1.15E-01
10
1.21E-01
1.16E-01
1.12E-01
1.02E-01
1.19E-01
1.09E-01
1.02E-01
1.07E-01
1.13E-01
1.17E-01
1.18E-01
1.18E-01
20
1.23E-01
1.14E-01
1.13E-01
9.70E-02
1.14E-01
1.07E-01
1.20E-01
1.02E-01
1.14E-01
1.09E-01
1.21E-01
1.17E-01
30
1.18E-01
1.11E-01
1.12E-01
1.03E-01
1.19E-01
1.06E-01
1.11E-01
1.06E-01
9.50E-02
1.13E-01
1.16E-01
1.16E-01
50
1.16E-01
1.10E-01
9.40E-02
9.80E-02
1.10E-01
1.03E-01
1.15E-01
9.60E-02
1.10E-01
1.06E-01
1.22E-01
1.12E-01
60
1.16E-01
1.07E-01
1.08E-01
8.90E-02
1.08E-01
8.80E-02
1.15E-01
9.40E-02
9.40E-02
1.04E-01
1.22E-01
1.14E-01
70
9.90E-02
1.07E-01
1.08E-01
1.01E-01
9.70E-02
1.06E-01
1.18E-01
1.08E-01
1.08E-01
1.12E-01
1.18E-01
1.14E-01
1.11E-01
7.79E-03
1.32E-01
8.94E-02
1.14E-01
7.52E-03
1.35E-01
9.34E-02
1.12E-01
9.42E-03
1.38E-01
8.64E-02
1.13E-01
6.43E-03
1.30E-01
9.50E-02
1.06E-01
9.21E-03
1.31E-01
8.03E-02
1.06E-01
9.96E-03
1.33E-01
7.83E-02
1.02E-01
4.88E-03
1.16E-01
8.90E-02
1.14E-01
4.87E-03
1.27E-01
1.00E-01
6.00E-02
PASS
1.10E-01
5.73E-03
1.25E-01
9.39E-02
5.00E-02
PASS
1.10E-01
6.88E-03
1.29E-01
9.15E-02
5.00E-02
PASS
1.06E-01
6.98E-03
1.25E-01
8.71E-02
4.00E-02
PASS
1.06E-01
7.18E-03
1.26E-01
8.63E-02
3.00E-02
PASS
9.90E-02
1.06E-02
1.28E-01
6.99E-02
3.00E-02
PASS
1.10E-01
4.77E-03
1.23E-01
9.73E-02
3.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
127
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Slew Rate 1 @ +15V (V/us)
0.00E+00
-2.00E-02
-4.00E-02
-6.00E-02
-8.00E-02
-1.00E-01
-1.20E-01
-1.40E-01
-1.60E-01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.61. Plot of Negative Slew Rate 1 @ +15V (V/us) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.61. Raw data for Negative Slew Rate 1 @ +15V (V/us) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 1 @ +15V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.33E-01
-1.23E-01
-1.24E-01
-1.13E-01
-1.09E-01
-1.19E-01
-1.28E-01
-1.13E-01
-1.12E-01
-1.22E-01
-1.22E-01
-1.22E-01
10
-1.29E-01
-1.21E-01
-1.24E-01
-1.15E-01
-1.30E-01
-1.14E-01
-1.22E-01
-1.12E-01
-1.24E-01
-1.14E-01
-1.28E-01
-1.22E-01
20
-1.25E-01
-1.17E-01
-1.21E-01
-1.08E-01
-1.17E-01
-1.09E-01
-1.24E-01
-1.12E-01
-1.21E-01
-1.18E-01
-1.26E-01
-1.20E-01
30
-1.24E-01
-1.20E-01
-1.15E-01
-1.07E-01
-1.14E-01
-1.10E-01
-1.20E-01
-9.00E-02
-1.12E-01
-1.13E-01
-1.20E-01
-1.23E-01
50
-1.27E-01
-1.16E-01
-1.13E-01
-9.30E-02
-1.22E-01
-9.60E-02
-1.17E-01
-1.02E-01
-1.08E-01
-1.15E-01
-1.19E-01
-1.22E-01
24 hr
Anneal
168 hr
Anneal
60
-1.19E-01
-1.18E-01
-9.80E-02
-9.60E-02
-1.20E-01
-1.08E-01
-1.19E-01
-1.04E-01
-1.15E-01
-1.13E-01
-1.24E-01
-1.05E-01
70
-1.20E-01
-1.18E-01
-1.15E-01
-1.13E-01
-1.21E-01
-9.90E-02
-1.22E-01
-1.12E-01
-1.24E-01
-1.18E-01
-1.25E-01
-1.27E-01
-1.20E-01 -1.24E-01 -1.18E-01 -1.16E-01 -1.14E-01 -1.10E-01 -1.17E-01
9.53E-03 6.14E-03 6.31E-03 6.44E-03 1.30E-02 1.21E-02 3.36E-03
-9.43E-02 -1.07E-01 -1.00E-01 -9.83E-02 -7.85E-02 -7.70E-02 -1.08E-01
-1.47E-01 -1.41E-01 -1.35E-01 -1.34E-01 -1.50E-01 -1.43E-01 -1.27E-01
-1.19E-01
6.61E-03
-1.01E-01
-1.37E-01
-6.00E-02
PASS
-1.17E-01
5.40E-03
-1.02E-01
-1.32E-01
-5.00E-02
PASS
-1.17E-01
6.22E-03
-9.97E-02
-1.34E-01
-5.00E-02
PASS
-1.09E-01
1.13E-02
-7.81E-02
-1.40E-01
-4.00E-02
PASS
-1.08E-01
8.79E-03
-8.35E-02
-1.32E-01
-3.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
129
-1.12E-01
5.89E-03
-9.56E-02
-1.28E-01
-3.00E-02
PASS
-1.15E-01
1.00E-02
-8.74E-02
-1.43E-01
-3.00E-02
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Slew Rate 2 @ +15V (V/us)
0.00E+00
-2.00E-02
-4.00E-02
-6.00E-02
-8.00E-02
-1.00E-01
-1.20E-01
-1.40E-01
-1.60E-01
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.62. Plot of Negative Slew Rate 2 @ +15V (V/us) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-578 100413 R1.0
Table 5.62. Raw data for Negative Slew Rate 2 @ +15V (V/us) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 2 @ +15V (V/us)
Device
4
51
54
104
105
152
155
156
202
205
530
561
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.30E-01
-1.28E-01
-1.22E-01
-1.14E-01
-1.26E-01
-1.19E-01
-1.21E-01
-1.04E-01
-1.19E-01
-1.28E-01
-1.23E-01
-1.21E-01
10
-1.38E-01
-1.31E-01
-1.21E-01
-1.14E-01
-1.27E-01
-1.14E-01
-1.27E-01
-1.12E-01
-1.19E-01
-1.21E-01
-1.28E-01
-1.23E-01
20
-1.28E-01
-1.25E-01
-1.25E-01
-1.15E-01
-1.26E-01
-1.12E-01
-1.29E-01
-1.11E-01
-1.18E-01
-1.19E-01
-1.25E-01
-1.23E-01
30
-1.29E-01
-1.25E-01
-1.19E-01
-1.12E-01
-1.21E-01
-1.10E-01
-1.26E-01
-1.09E-01
-1.15E-01
-1.14E-01
-1.25E-01
-1.25E-01
50
-1.25E-01
-1.20E-01
-1.01E-01
-9.10E-02
-1.17E-01
-1.11E-01
-1.15E-01
-1.06E-01
-1.17E-01
-1.13E-01
-1.29E-01
-1.25E-01
24 hr
Anneal
168 hr
Anneal
60
-1.28E-01
-1.17E-01
-1.14E-01
-1.06E-01
-1.14E-01
-1.06E-01
-1.24E-01
-1.10E-01
-1.11E-01
-1.11E-01
-1.27E-01
-1.23E-01
70
-1.23E-01
-1.22E-01
-1.03E-01
-1.12E-01
-1.24E-01
-1.12E-01
-1.26E-01
-1.13E-01
-1.18E-01
-1.19E-01
-1.30E-01
-1.23E-01
-1.24E-01 -1.26E-01 -1.24E-01 -1.21E-01 -1.11E-01 -1.16E-01 -1.17E-01
6.32E-03 9.20E-03 5.07E-03 6.42E-03 1.43E-02 7.95E-03 9.09E-03
-1.07E-01 -1.01E-01 -1.10E-01 -1.04E-01 -7.17E-02 -9.40E-02 -9.19E-02
-1.41E-01 -1.51E-01 -1.38E-01 -1.39E-01 -1.50E-01 -1.38E-01 -1.42E-01
-1.18E-01
8.76E-03
-9.42E-02
-1.42E-01
-6.00E-02
PASS
-1.19E-01
5.94E-03
-1.02E-01
-1.35E-01
-5.00E-02
PASS
-1.18E-01
7.19E-03
-9.81E-02
-1.38E-01
-5.00E-02
PASS
-1.15E-01
6.76E-03
-9.63E-02
-1.33E-01
-4.00E-02
PASS
-1.12E-01
4.22E-03
-1.01E-01
-1.24E-01
-3.00E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
131
-1.12E-01
6.80E-03
-9.37E-02
-1.31E-01
-3.00E-02
PASS
-1.18E-01
5.59E-03
-1.02E-01
-1.33E-01
-3.00E-02
PASS
ELDRS Report
09-578 100413 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
6.0. Summary / Conclusions
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source.
Samples of the RH1078MJ8 Dual Precision Op Amp described in this report were irradiated biased with
a static split 15V supply and unbiased (all leads tied to ground). The devices were irradiated to a
maximum total ionizing dose level of 50krad(Si) with a pre-irradiation baseline reading as well as
incremental readings at 10, 20, and 30krad(Si). Electrical testing occurred within one hour following the
end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total
dose exposure within two hours from the end of the previous radiation increment. In addition, all unitsunder-test received a 24hr room temperature and 168hr 100°C anneal, using the same bias conditions as
the radiation exposure.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814
using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were
selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the
qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be
met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces
irradiated under electrical bias shall pass the specification value. The units irradiated without electrical
bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated
under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Using the conditions stated above, the RH1078MJ8 Dual Precision Op Amp (from the lot date code
identified on the first page of this test report) passed the low dose rate test to the maximum tested level
of 50krad(Si) with no significant degradation observed on any measured parameter. Note that the data
presented in this report for the units-under-test irradiated in the unbiased condition and the KTL
statistics are for reference only and are not used for the determination of “PASS/FAIL” for the lot.
Further, the data in this report can be analyzed along with the report titled “Total Ionizing Dose (TID)
Radiation Testing of the RH1078MJ8 Dual Precision Op Amp for Linear Technology” to demonstrate
that these parts do not exhibit ELDRS as defined in the current test method.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
Biased Samples:
Pin
1
2
3
4
5
6
7
8
Function
OUT A
-INPUT A
+INPUT A
V+INPUT B
-INPUT B
OUT B
V+
Connection / Bias
To Pin 2 via 10kΩ Resistor
To Pin 1 via 10kΩ Resistor
To 8V via 10kΩ Resistor
To –15V using 0.1μF Decoupling
To 8V via 10kΩ Resistor
To Pin 9 via 10kΩ Resistor
To Pin 8 via 10kΩ Resistor
To +15V using 0.1μF Decoupling
Unbiased Samples:
Pin
1
2
3
4
5
6
7
8
Function
OUT A
-INPUT A
+INPUT A
V+INPUT B
-INPUT B
OUT B
V+
Connection / Bias
GND
GND
GND
GND
GND
GND
GND
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was
extracted from LINEAR TECHNOLOGY CORPORATION RH1078M Datasheet.
Figure B.2. J8 package drawing (for reference only). This figure was extracted from LINEAR
TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR,
MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
operational amplifiers, voltage comparators, D to A and A to D converters. The LTS2020 Test System
achieves accuracy and sensitivity through the use of software self-calibration and an internal relay
matrix with separate family boards and custom personality adapter boards. The tester uses this relay
matrix to connect the required test circuits, select the appropriate voltage / current sources and establish
the needed measurement loops for all the tests performed. The measured parameters and test conditions
are shown in Table C.1.
Note that test numbers 19 and 20 are modified from the datasheet condition of VCM=100mV to VCM=0V.
This is because the LTS2020 measurement circuit has an impedance of ~333kΩ, such that at 100mV it
is effectively injecting ~300nA of current. This is enough to raise the measured VOL by ~1mV. In our
estimation, modifying the test condition as specified, plus biasing the amp not being measured to have a
VOUT of ~100mV to make sure it’s not saturated, reduces the current injected by the measurement circuit
to ~30nA or less.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain,
where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes
could be used to qualify these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1078MJ8.
TEST NUMBER
TEST DESCRIPTION
TEST CONDITIONS
1
Positive Supply Current (ICC2)
V=+5V
2
Negative Supply Current (IEE2)
V=+5V
3&4
Input Offset Voltage (VOS1 &VOS2)
V=+5V
5&6
Input Offset Current (IOS1 & IOS2)
V=+5V
7&8
+ Input Bias Current (IB+1 & IB+2)
V=+5V
9 & 10
- Input Bias Current (IB-1 & IB-2)
V=+5V
11 & 12
Common Mode Rejection Ratio (CMRR1 & CMRR2)
V=+5V, VCM = 0V to 3.5V
13 & 14
Power Supply Rejection Ratio (PSRR1 & PSRR2)
V= 2.3V to 12V
15 & 16
Large Signal Voltage Gain (AVOL 1 &AVOL2)
V=+5V, RL =Open
17 & 18
Large Signal Voltage Gain (AVOL3 &AVOL4)
V=+5V, RL =50kΩ
19 & 20
VOUT Low (VOUTLOW1 & VOUTLOW2)
V=+5V, RL =Open, VCM = 0V*
21 & 22
VOUT Low (VOUTLOW3 & VOUTLOW4)
V=+5V, RL =2kΩ
23 & 24
VOUT Low (VOUTLOW5 & VOUTLOW6)
V=+5V, ISINK=100µA
25 & 26
VOUT High (VOUTHIGH1 & VOUTHIGH2)
V=+5V, RL =Open
27 & 28
VOUT High (VOUTHIGH3 & VOUTHIGH4)
V=+5V, RL =2kΩ
29 & 30
+SR (Slew Rate 1 and Slew Rate 2)
V=+5V, AV=1
31 & 32
-SR (Slew Rate 3 and Slew Rate 4)
V=+5V, AV=1
33
Positive Supply Current (ICC2)
V=±15V
34
Negative Supply Current (IEE2)
V=±15V
35 & 36
Input Offset Voltage (VOS3 &VOS4)
V=±15V
37 & 38
Input Offset Current (IOS3 & IOS4)
V=±15V
39 & 40
+ Input Bias Current (IB+3 & IB+4)
V=±15V
41 & 42
- Input Bias Current (IB-3 & IB-4)
V=±15V
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TEST NUMBER
TEST DESCRIPTION
TEST CONDITIONS
43 & 44
Common Mode Rejection Ratio (CMRR3 & CMRR4)
V=±15V, VCM = 13.5V, –15V
Power Supply Rejection Ratio (PSRR3 & PSRR4)
V= 5V, 0V to ±18V
Large Signal Voltage Gain (AVOL 5 &AVOL6)
V=±15V, RL=50kΩ
49 & 50
Large Signal Voltage Gain (AVOL 7 &AVOL8)
V=±15V, RL=2kΩ
51 & 52
VOUT High (VOUTHIGH5 & VOUTHIGH6)
V=±15V, RL=50kΩ
53 & 54
VOUT High (VOUTHIGH7 & VOUTHIGH8)
V=±15V, RL=2kΩ
55 & 56
VOUT Low (VOUTLOW7 & VOUTLOW8)
V=±15V, RL=50kΩ
57 & 58
VOUT Low (VOUTLOW9 & VOUTLOW10)
V=±15V, RL=2kΩ
59 & 60
+SR (Slew Rate 5 and Slew Rate 6)
V=±15V, AV=1
60 & 61
-SR (Slew Rate 7 and Slew Rate 8)
V=±15V, AV=1
45 & 46
47 & 48
* This is non-datasheet condition, see above for explanation.
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Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution
for the RH1078MJ8.
Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current (ICC)
1.5E-04A
± 1.31E-06A
Negative Supply Current (IEE)
-1.5E-04A
± 1.07E-06A
Input Offset Voltage (VOS1 &VOS2)
±1.2E-04V
± 3.41E-06V
Input Offset Current (IOS1 & IOS2)
±8E-10A
± 5.06E-11A
+ Input Bias Current (IB+1 & IB+2)
±1.5E-08A
± 5.88E-11A
- Input Bias Current (IB-1 & IB-2)
±1.5E-08A
± 8.03E-11A
94dB
± 3.12E+00 dB
100dB
± 5.70E+00dB
Large Signal Voltage Gain (AVOL 1 &AVOL2)
150V/mV
± 2.69E+02V/mV
Large Signal Voltage Gain (AVOL3 &AVOL4)
120V/mV
± 7.13E+02 V/mV
VOUT Low (VOUTLOW1 & VOUTLOW2)
6E-03V
± 1.16E-04V
VOUT Low (VOUTLOW3 & VOUTLOW4)
2E-03V
± 3.43E-05V
VOUT Low (VOUTLOW5 & VOUTLOW6)
1.3E-01V
± 3.22E-04V
VOUT High (VOUTHIGH1 & VOUTHIGH2)
4.2V
± 3.11E-03V
VOUT High (VOUTHIGH3 & VOUTHIGH4)
3.5V
± 2.13E-03V
+SR (Slew Rate 1 and Slew Rate 2)
4E-02V/μs
± 1.07E-03V/μs
-SR (Slew Rate 3 and Slew Rate 4)
-4E-02V/μs
± 1.81E-03 V/μs
2E-04A
± 1.74E-06A
Measured Parameter
Common Mode Rejection Ratio (CMRR1 &
CMRR2)
Power Supply Rejection Ratio (PSRR1 &
PSRR2)
Positive Supply Current (ICC2)
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Pre-Irradiation
Specification
Measurement
Resolution/Precision
Negative Supply Current (IEE2)
-2E-04A
± 9.73E-07A
Input Offset Voltage (VOS3 &VOS4)
±3.5E-4V
± 2.51E-06V
Input Offset Current (IOS3 & IOS4)
±8E-10A
± 3.54E-11A
+ Input Bias Current (IB+3 & IB+4)
±1.5E-08A
± 3.89E-11A
- Input Bias Current (IB-3 & IB-4)
±1.5E-08A
± 7.51E-11A
97dB
± 2.98E-01dB
100dB
± 4.20E+00dB
Large Signal Voltage Gain (AVOL 5 &AVOL6)
1000V/mV
± 2.34E+04V/mV
Large Signal Voltage Gain (AVOL 7 &AVOL8)
300V/mV
± 7.07E+01V/mV
VOUT High (VOUTHIGH5 & VOUTHIGH6)
13V
± 2.38E-03V
VOUT High (VOUTHIGH7 & VOUTHIGH8)
11V
± 1.17E-03V
VOUT Low (VOUTLOW7 & VOUTLOW8)
-13V
± 1.75E-03V
VOUT Low (VOUTLOW9 & VOUTLOW10)
-11V
± 4.14E-03V
+SR (Slew Rate 5 and Slew Rate 6)
6E-02V/μs
± 6.97E-03V/μs
-SR (Slew Rate 7 and Slew Rate 8)
-6E-02V/μs
± 9.02E-03V/μs
Measured Parameter
Common Mode Rejection Ratio (CMRR3 &
CMRR4)
Power Supply Rejection Ratio (PSRR3 &
PSRR4)
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Appendix D: List of Figures used in Section 5 (Test Results)
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