ELDRS Report_RH1014MW_Fab Lot W10737612.1.pdf

ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1014MW Quad Precision Operational Amplifier for Linear Technology
Customer: Linear Technology, PO# 58124L
RAD Job Number: 10-493
Part Type Tested: RH1014MW#50197 Quad Precision Operational Amplifier.
Traceability Information/Lot Number/ Date Code: Lot Date Code: 0942A, Fab Lot Number: W10737612.1,
Wafer Number: 01, Assembly Lot Number: 508659.1. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 units for
control. Serial numbers 1114-1118 were biased during irradiation, serial numbers 1119-1123 were unbiased
during irradiation and serial numbers 1124 and 1125 were used as control. Control units will be shared with RAD
Job 10-493. See Appendix B for the radiation bias connection table.
Radiation and Electrical Test Increments: 10mrad(Si)/s ionizing radiation with electrical test increments: preirradiation, 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by linear Technology prior to receipt by RAD.
Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168-hour
100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical
measurements shall be made following each anneal increment.
Radiation Test Standard: MIL-STD 883 and/or MIL-STD-750 TM1019 (latest revision), Condition D.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS03, Calibration Date: 04-28-10,
Calibration Due 04-28-11. LTS2101 Family Board, Entity ID FB02. LTS0600 Test Fixture, Entity ID TF03.
BGSS 970312 RH1014 DUT Board. Test Program: RH1014LT.SR2
Facility and Radiation Source: Radiation Assured Devices' Longmire Laboratories, Colorado Springs, CO.
Gamma rays provided by Co60 (GB-150) low dose rate source. Dosimetry performed by Air Ionization Chamber
(AIC) traceable to NIST. RAD's dosimetry has been audited by DSCC and RAD has been awarded Laboratory
Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MILSTD-750.
Low Dose Rate Test Result: PASSED the enhanced low dose rate sensitivity
test to the maximum tested dose level of 50krad(Si) with all parameters
remaining within their datasheet specifications. Further the units do not exhibit
ELDRS as defined in the current test method.
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ELDRS Report
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6µm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as "birds-beak" oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a "conventional" room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883 TM 1019.8). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883 TM 1019 requires that devices that could
potentially exhibit ELDRS "shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin". While the recently released MIL-STD883 TM 1019 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883 TM1019.8 Condition D, we have performed a low dose rate test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The low dose rate testing described in this final report was performed using the facilities at Radiation
Assured Devices' Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the
irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic
timer/controller and the exposure is performed in air. The dose rate for this irradiator in this
configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s,
determined by the distance from the source. For low dose rate testing described in this report, the
devices are placed approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained
by Radiation Assured Devices' Longmire Laboratories using air ionization chamber (AIC) dosimetry
traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph
of the GB-150 Co-60 irradiator at RAD's Longmire Laboratory facility.
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ELDRS Report
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Figure 2.1. Radiation Assured Devices' Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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3.0. Radiation Test Conditions
The RH1014MW Quad Precision Operational Amplifier described in this final report were irradiated
using a split 15V supply and with all pins tied to ground, that is biased and unbiased. See Appendix B
for details on the biasing conditions during radiation exposure. In our opinion, this bias circuit satisfies
the requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states
"The bias applied to the test devices shall be selected to produce the greatest radiation induced damage
or the worst-case damage for the intended application, if known. While maximum voltage is often worst
case some bipolar linear device parameters (e.g. input bias current or maximum output load current)
exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10krad(Si), 20krad(Si) and 30krad(Si). Electrical testing occurred within one hour following
the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to
total dose exposure within two hours from the end of the previous radiation increment. The radiation
exposure bias board was positioned in the Co-60 cell to provide the targeted dose rate of 10mrad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted".
The final dose rate within the lead-aluminum box was determined based on air ionization chamber
(AIC) dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose
rate for this work was 10mrad(Si)/s with a precision of ±5%.
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ELDRS Report
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(719) 531-0800
4.0. Tested Parameters
During the enhanced low dose rate sensitivity testing the following electrical parameters were measured
pre- and post-irradiation:
1. Positive Supply Current @ +/-15V (A)
2. Negative Supply Current @ +/-15V (A)
3. Offset Voltage 1 @ +/-15V (V)
4. Offset Voltage 2 @ +/-15V (V)
5. Offset Voltage 3 @ +/-15V (V)
6. Offset Voltage 4 @ +/-15V (V)
7. Offset Current 1 @ +/-15V (A)
8. Offset Current 2 @ +/-15V (A)
9. Offset Current 3 @ +/-15V (A)
10. Offset Current 4 @ +/-15V (A)
11. Positive Bias Current 1 @ +/-15V (A)
12. Positive Bias Current 2 @ +/-15V (A)
13. Positive Bias Current 3 @ +/-15V (A)
14. Positive Bias Current 4 @ +/-15V (A)
15. Negative Bias Current 1 @ +/-15V (A)
16. Negative Bias Current 2 @ +/-15V (A)
17. Negative Bias Current 3 @ +/-15V (A)
18. Negative Bias Current 4 @ +/-15V (A)
19. Common Mode Rejection Ratio 1 (dB)
20. Common Mode Rejection Ratio 2 (dB)
21. Common Mode Rejection Ratio 3 (dB)
22. Common Mode Rejection Ratio 4 (dB)
23. Power Supply Rejection Ratio 1 (dB)
24. Power Supply Rejection Ratio 2 (dB)
25. Power Supply Rejection Ratio 3 (dB)
26. Power Supply Rejection Ratio 4 (dB)
27. Open Loop Gain 1 RL=10k VO=+/-10V (V/mV)
28. Open Loop Gain 2 RL=10k VO=+/-10V (V/mV)
29. Open Loop Gain 3 RL=10k VO=+/-10V (V/mV)
30. Open Loop Gain 4 RL=10k VO=+/-10V (V/mV)
31. Positive Output Voltage 1 @ +/-15V (V)
32. Positive Output Voltage 2 @ +/-15V (V)
33. Positive Output Voltage 3 @ +/-15V (V)
34. Positive Output Voltage 4 @ +/-15V (V)
35. Negative Output Voltage 1 @ +/-15V (V)
36. Negative Output Voltage 2 @ +/-15V (V)
37. Negative Output Voltage 3 @ +/-15V (V)
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38. Negative Output Voltage 4 @ +/-15V (V)
39. Positive Slew Rate 1 @ +/-15V (V/us)
40. Positive Slew Rate 2 @ +/-15V (V/us)
41. Positive Slew Rate 3 @ +/-15V (V/us)
42. Positive Slew Rate 4 @ +/-15V (V/us)
43. Negative Slew Rate 1 @ +/-15V (V/us)
44. Negative Slew Rate 2 @ +/-15V (V/us)
45. Negative Slew Rate 3 @ +/-15V (V/us)
46. Negative Slew Rate 4 @ +/-15V (V/us)
47. Positive Supply Current @ +5V (A)
48. Negative Supply Current @ +5V (A)
49. Offset Voltage 1 @ +5V (V)
50. Offset Voltage 2 @ +5V (V)
51. Offset Voltage 3 @ +5V (V)
52. Offset Voltage 4 @ +5V (V)
53. Offset Current 1 @ +5V (A)
54. Offset Current 2 @ +5V (A)
55. Offset Current 3 @ +5V (A)
56. Offset Current 4 @ +5V (A)
57. Positive Bias Current 1 @ +5V (A)
58. Positive Bias Current 2 @ +5V (A)
59. Positive Bias Current 3 @ +5V (A)
60. Positive Bias Current 4 @ +5V (A)
61. Negative Bias Current 1 @ +5V (A)
62. Negative Bias Current 2 @ +5V (A)
63. Negative Bias Current 3 @ +5V (A)
64. Negative Bias Current 4 @ +5V (A)
65. Positive Output Voltage 1 RL=open @ +5V (V)
66. Positive Output Voltage 2 RL=open @ +5V (V)
67. Positive Output Voltage 3 RL=open @ +5V (V)
68. Positive Output Voltage 4 RL=open @ +5V (V)
69. Positive Output Voltage 1 RL=600 @ +5V (V)
70. Positive Output Voltage 2 RL=600 @ +5V (V)
71. Positive Output Voltage 3 RL=600 @ +5V (V)
72. Positive Output Voltage 4 RL=600 @ +5V (V)
73. Output Voltage Low 1 RL=open @ +5V (V)
74. Output Voltage Low 2 RL=open @ +5V (V)
75. Output Voltage Low 3 RL=open @ +5V (V)
76. Output Voltage Low 4 RL=open @ +5V (V)
77. Output Voltage Low 1 RL=600 @ +5V (V)
78. Output Voltage Low 2 RL=600 @ +5V (V)
79. Output Voltage Low 3 RL=600 @ +5V (V)
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ELDRS Report
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80. Output Voltage Low 4 RL=600 @ +5V (V)
81. Output Voltage Low 1 IL=1mA @ +5V (V)
82. Output Voltage Low 2 IL=1mA @ +5V (V)
83. Output Voltage Low 3 IL=1mA @ +5V (V)
84. Output Voltage Low 4 IL=1mA @ +5V (V)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
Further, MIL-STD-883H, TM 1019.8 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS' states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (para) for each
sample at each radiation level. Calculate the ratio of the median para at low dose rate to the median
para at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled "Total
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Ionizing Dose (TID) Radiation Testing of the RH1014MW Quad Precision Operational Amplifier for
Linear Technology" to demonstrate that these parts do not exhibit ELDRS as defined in the current test
method.
5.0. ELDRS Test Results
Based on this criterion the RH1014MW Quad Precision Operational Amplifier (from the lot date code
identified on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the
maximum tested dose level of 50krad(Si) with all parameters remaining within their datasheet
specifications.
Figures 5.1 through 5.84 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.84 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change during
the anneal.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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ELDRS Report
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Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Positive Supply Current @ +/-15V (A)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.1. Plot of Positive Supply Current @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
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Table 5.1. Raw data for Positive Supply Current @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Supply Current @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.51E-03 1.53E-03 1.51E-03 1.49E-03 1.43E-03 1.43E-03 1.40E-03
1115 1.55E-03 1.55E-03 1.55E-03 1.53E-03 1.46E-03 1.47E-03 1.44E-03
1116 1.51E-03 1.52E-03 1.51E-03 1.48E-03 1.42E-03 1.42E-03 1.39E-03
1117 1.53E-03 1.55E-03 1.54E-03 1.52E-03 1.45E-03 1.45E-03 1.43E-03
1118 1.56E-03 1.57E-03 1.57E-03 1.55E-03 1.48E-03 1.48E-03 1.45E-03
1119 1.55E-03 1.56E-03 1.54E-03 1.53E-03 1.49E-03 1.48E-03 1.49E-03
1120 1.54E-03 1.58E-03 1.57E-03 1.55E-03 1.51E-03 1.51E-03 1.51E-03
1121 1.55E-03 1.59E-03 1.58E-03 1.57E-03 1.53E-03 1.53E-03 1.52E-03
1122 1.50E-03 1.55E-03 1.54E-03 1.53E-03 1.48E-03 1.48E-03 1.48E-03
1123 1.52E-03 1.57E-03 1.56E-03 1.55E-03 1.51E-03 1.50E-03 1.50E-03
1124 1.49E-03 1.49E-03 1.49E-03 1.50E-03 1.49E-03 1.49E-03 1.50E-03
1125 1.51E-03 1.51E-03 1.52E-03 1.52E-03 1.51E-03 1.51E-03 1.52E-03
Biased Statistics
Average Biased
1.53E-03 1.54E-03 1.53E-03 1.51E-03 1.45E-03 1.45E-03 1.42E-03
Std Dev Biased
2.55E-05 2.02E-05 2.64E-05 2.58E-05 2.58E-05 2.40E-05 2.80E-05
Ps99%/90% (+KTL) Biased
1.65E-03 1.64E-03 1.66E-03 1.63E-03 1.57E-03 1.56E-03 1.55E-03
Ps99%/90% (-KTL) Biased
1.41E-03 1.45E-03 1.41E-03 1.39E-03 1.33E-03 1.34E-03 1.29E-03
Un-Biased Statistics
Average Un-Biased
1.53E-03 1.57E-03 1.56E-03 1.55E-03 1.50E-03 1.50E-03 1.50E-03
Std Dev Un-Biased
2.16E-05 1.60E-05 1.68E-05 1.83E-05 1.88E-05 2.06E-05 1.69E-05
Ps99%/90% (+KTL) Un-Biased
1.63E-03 1.65E-03 1.63E-03 1.63E-03 1.59E-03 1.60E-03 1.58E-03
Ps99%/90% (-KTL) Un-Biased
1.43E-03 1.50E-03 1.48E-03 1.46E-03 1.42E-03 1.41E-03 1.42E-03
Specification MAX
2.20E-03 2.20E-03 2.20E-03 2.20E-03 2.20E-03 2.20E-03 2.20E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Negative Supply Current @ +/-15V (A)
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.2. Plot of Negative Supply Current @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.2. Raw data for Negative Supply Current @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Supply Current @ +/-15V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.51E-03
-1.56E-03
-1.51E-03
-1.53E-03
-1.57E-03
-1.55E-03
-1.54E-03
-1.55E-03
-1.50E-03
-1.52E-03
-1.49E-03
-1.51E-03
Total
10
-1.53E-03
-1.55E-03
-1.52E-03
-1.55E-03
-1.57E-03
-1.57E-03
-1.58E-03
-1.60E-03
-1.55E-03
-1.57E-03
-1.49E-03
-1.51E-03
Dose (krad(Si))
20
30
-1.51E-03 -1.50E-03
-1.55E-03 -1.53E-03
-1.51E-03 -1.48E-03
-1.54E-03 -1.52E-03
-1.57E-03 -1.55E-03
-1.55E-03 -1.53E-03
-1.57E-03 -1.55E-03
-1.58E-03 -1.57E-03
-1.54E-03 -1.53E-03
-1.56E-03 -1.55E-03
-1.49E-03 -1.50E-03
-1.51E-03 -1.52E-03
50
-1.43E-03
-1.47E-03
-1.42E-03
-1.45E-03
-1.48E-03
-1.49E-03
-1.51E-03
-1.53E-03
-1.49E-03
-1.50E-03
-1.49E-03
-1.51E-03
24-hr
Anneal
60
-1.44E-03
-1.47E-03
-1.42E-03
-1.45E-03
-1.48E-03
-1.48E-03
-1.51E-03
-1.53E-03
-1.48E-03
-1.50E-03
-1.50E-03
-1.52E-03
168-hr
Anneal
70
-1.40E-03
-1.44E-03
-1.39E-03
-1.43E-03
-1.46E-03
-1.49E-03
-1.51E-03
-1.52E-03
-1.48E-03
-1.50E-03
-1.50E-03
-1.52E-03
-1.53E-03 -1.54E-03 -1.54E-03 -1.52E-03 -1.45E-03 -1.45E-03 -1.42E-03
2.64E-05 2.10E-05 2.66E-05 2.57E-05 2.61E-05 2.38E-05 2.82E-05
-1.41E-03 -1.45E-03 -1.41E-03 -1.40E-03 -1.33E-03 -1.34E-03 -1.29E-03
-1.66E-03 -1.64E-03 -1.66E-03 -1.64E-03 -1.57E-03 -1.56E-03 -1.55E-03
-1.53E-03
2.05E-05
-1.44E-03
-1.63E-03
-2.20E-03
PASS
-1.57E-03
1.62E-05
-1.50E-03
-1.65E-03
-2.20E-03
PASS
-1.56E-03
1.69E-05
-1.48E-03
-1.64E-03
-2.20E-03
PASS
-1.55E-03
1.81E-05
-1.46E-03
-1.63E-03
-2.20E-03
PASS
-1.50E-03
1.86E-05
-1.42E-03
-1.59E-03
-2.20E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
12
-1.50E-03
2.11E-05
-1.40E-03
-1.60E-03
-2.20E-03
PASS
-1.50E-03
1.69E-05
-1.42E-03
-1.58E-03
-2.20E-03
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 1 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.3. Plot of Offset Voltage 1 @ +/-15V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.3. Raw data for Offset Voltage 1 @ +/-15V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 1 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.53E-04
-4.83E-06
-1.88E-05
5.48E-05
9.61E-05
1.20E-04
1.61E-05
-3.16E-05
-2.17E-05
4.31E-05
-6.28E-05
-1.10E-05
Total
10
1.45E-04
-6.76E-06
-1.96E-05
5.18E-05
9.33E-05
1.23E-04
2.93E-05
-2.09E-05
-1.75E-05
5.09E-05
-6.29E-05
-1.12E-05
24-hr
Dose (krad(Si))
Anneal
20
30
50
60
1.55E-04 1.60E-04 1.85E-04 1.85E-04
2.29E-06 8.93E-06 3.16E-05 3.16E-05
-6.40E-06 6.27E-06 3.32E-05 3.38E-05
6.24E-05 7.15E-05 9.81E-05 9.79E-05
1.01E-04 1.13E-04 1.40E-04 1.39E-04
1.31E-04 1.34E-04 1.53E-04 1.54E-04
4.24E-05 5.23E-05 7.81E-05 8.00E-05
-1.49E-05 -9.54E-06 7.00E-06 5.79E-06
-5.68E-06 -6.10E-07 1.93E-05 1.88E-05
5.88E-05 6.28E-05 8.73E-05 8.58E-05
-6.55E-05 -6.36E-05 -6.40E-05 -6.34E-05
-1.17E-05 -1.10E-05 -1.18E-05 -1.26E-05
168-hr
Anneal
70
1.85E-04
1.61E-05
2.78E-05
8.40E-05
1.18E-04
1.29E-04
3.79E-05
-9.42E-06
-4.60E-06
5.50E-05
-6.23E-05
-1.29E-05
5.60E-05 5.27E-05 6.28E-05 7.19E-05 9.76E-05 9.75E-05 8.60E-05
7.12E-05 6.86E-05 6.79E-05 6.65E-05 6.70E-05 6.68E-05 6.89E-05
3.88E-04 3.73E-04 3.79E-04 3.82E-04 4.10E-04 4.09E-04 4.08E-04
-2.76E-04 -2.68E-04 -2.54E-04 -2.39E-04 -2.15E-04 -2.14E-04 -2.36E-04
2.52E-05
6.10E-05
3.10E-04
-2.59E-04
-3.00E-04
PASS
3.00E-04
PASS
3.30E-05
5.91E-05
3.09E-04
-2.43E-04
-4.50E-04
PASS
4.50E-04
PASS
4.23E-05
5.85E-05
3.15E-04
-2.31E-04
-4.50E-04
PASS
4.50E-04
PASS
4.78E-05
5.77E-05
3.17E-04
-2.21E-04
-5.00E-04
PASS
5.00E-04
PASS
6.89E-05
5.86E-05
3.42E-04
-2.05E-04
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
14
6.89E-05
5.95E-05
3.46E-04
-2.09E-04
-6.00E-04
PASS
6.00E-04
PASS
4.16E-05
5.60E-05
3.03E-04
-2.20E-04
-6.00E-04
PASS
6.00E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 2 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.4. Plot of Offset Voltage 2 @ +/-15V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.4. Raw data for Offset Voltage 2 @ +/-15V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 2 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-9.46E-05
-3.73E-05
-2.48E-05
4.12E-05
3.22E-05
-2.26E-05
2.61E-05
4.95E-06
-2.42E-05
3.26E-06
1.22E-05
-1.06E-05
Total
10
-8.97E-05
-2.29E-05
-1.27E-05
5.67E-05
4.24E-05
-1.96E-05
2.95E-05
1.34E-05
-1.78E-05
1.22E-05
1.28E-05
-8.57E-06
24-hr
Dose (krad(Si))
Anneal
20
30
50
60
-7.51E-05 -5.98E-05 -3.75E-05 -3.79E-05
-1.71E-05 -1.14E-05 5.19E-06 4.34E-06
-4.47E-06 3.86E-06 2.06E-05 1.99E-05
6.39E-05 7.02E-05 8.50E-05 8.36E-05
4.97E-05 5.88E-05 7.82E-05 7.71E-05
-1.29E-05 -7.61E-06 4.94E-06 3.25E-06
3.46E-05 3.73E-05 4.67E-05 4.73E-05
1.80E-05 2.43E-05 3.46E-05 3.66E-05
-9.90E-06 -5.56E-06 8.20E-06 7.11E-06
1.63E-05 2.17E-05 3.20E-05 3.14E-05
1.36E-05 1.50E-05 1.33E-05 1.42E-05
-8.69E-06 -8.21E-06 -9.54E-06 -9.42E-06
168-hr
Anneal
70
-5.74E-05
-1.05E-05
1.80E-06
6.99E-05
6.05E-05
-1.33E-05
2.91E-05
1.44E-05
-2.03E-05
1.23E-05
1.36E-05
-8.34E-06
-1.67E-05 -5.24E-06 3.38E-06 1.24E-05 3.03E-05 2.94E-05 1.29E-05
5.55E-05 5.83E-05 5.58E-05 5.32E-05 5.15E-05 5.12E-05 5.27E-05
2.42E-04 2.67E-04 2.64E-04 2.61E-04 2.71E-04 2.68E-04 2.59E-04
-2.75E-04 -2.77E-04 -2.57E-04 -2.36E-04 -2.10E-04 -2.09E-04 -2.33E-04
-2.49E-06
2.11E-05
9.59E-05
-1.01E-04
-3.00E-04
PASS
3.00E-04
PASS
3.54E-06
2.14E-05
1.03E-04
-9.63E-05
-4.50E-04
PASS
4.50E-04
PASS
9.22E-06
2.02E-05
1.03E-04
-8.49E-05
-4.50E-04
PASS
4.50E-04
PASS
1.40E-05
1.97E-05
1.06E-04
-7.80E-05
-5.00E-04
PASS
5.00E-04
PASS
2.53E-05
1.80E-05
1.09E-04
-5.87E-05
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
16
2.51E-05
1.91E-05
1.14E-04
-6.42E-05
-6.00E-04
PASS
6.00E-04
PASS
4.43E-06
2.06E-05
1.00E-04
-9.16E-05
-6.00E-04
PASS
6.00E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 3 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.5. Plot of Offset Voltage 3 @ +/-15V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.5. Raw data for Offset Voltage 3 @ +/-15V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 3 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.03E-05
1.52E-05
-1.24E-05
-1.04E-05
-4.94E-05
6.24E-05
-3.14E-06
2.54E-05
5.71E-05
1.64E-05
-5.82E-05
-5.56E-06
Total
10
-4.04E-05
2.09E-05
-1.34E-05
-1.28E-05
-4.71E-05
6.37E-05
5.55E-06
3.91E-05
6.77E-05
2.61E-05
-5.77E-05
-4.11E-06
24-hr
168-hr
Dose (krad(Si))
Anneal
Anneal
20
30
50
60
70
-2.90E-05 -1.56E-05 9.41E-06 9.17E-06 8.92E-06
2.44E-05 3.03E-05 4.28E-05 4.15E-05 3.15E-05
-8.09E-06 -1.33E-06 1.92E-05 1.73E-05 1.01E-05
-4.71E-06 5.79E-06 2.73E-05 2.69E-05 2.34E-05
-4.08E-05 -3.32E-05 -1.69E-05 -1.85E-05 -2.51E-05
7.24E-05 7.69E-05 8.38E-05 8.50E-05 7.25E-05
1.17E-05 1.58E-05 2.87E-05 2.98E-05 1.40E-05
4.86E-05 5.61E-05 7.53E-05 7.41E-05 5.01E-05
7.39E-05 7.83E-05 9.08E-05 9.09E-05 6.99E-05
3.28E-05 3.77E-05 5.50E-05 5.47E-05 4.07E-05
-5.90E-05 -5.89E-05 -5.90E-05 -5.83E-05 -5.93E-05
-4.83E-06 -4.11E-06 -6.04E-06 -4.83E-06 -5.20E-06
-1.75E-05 -1.86E-05 -1.16E-05 -2.80E-06 1.64E-05 1.53E-05 9.77E-06
2.41E-05 2.70E-05 2.50E-05 2.38E-05 2.23E-05 2.24E-05 2.17E-05
9.51E-05 1.07E-04 1.05E-04 1.08E-04 1.20E-04 1.20E-04 1.11E-04
-1.30E-04 -1.44E-04 -1.28E-04 -1.14E-04 -8.75E-05 -8.92E-05 -9.13E-05
3.16E-05
2.77E-05
1.61E-04
-9.78E-05
-3.00E-04
PASS
3.00E-04
PASS
4.04E-05
2.60E-05
1.62E-04
-8.10E-05
-4.50E-04
PASS
4.50E-04
PASS
4.79E-05
2.65E-05
1.72E-04
-7.58E-05
-4.50E-04
PASS
4.50E-04
PASS
5.30E-05
2.66E-05
1.77E-04
-7.14E-05
-5.00E-04
PASS
5.00E-04
PASS
6.67E-05
2.51E-05
1.84E-04
-5.05E-05
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
18
6.69E-05
2.49E-05
1.83E-04
-4.93E-05
-6.00E-04
PASS
6.00E-04
PASS
4.94E-05
2.39E-05
1.61E-04
-6.21E-05
-6.00E-04
PASS
6.00E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-04
Offset Voltage 4 @ +/-15V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.6. Plot of Offset Voltage 4 @ +/-15V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.6. Raw data for Offset Voltage 4 @ +/-15V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 4 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.05E-06
-7.65E-05
5.78E-05
2.76E-05
3.91E-05
1.93E-06
-1.57E-05
-3.65E-05
-1.84E-05
-6.18E-05
-2.66E-05
2.80E-05
Total
10
7.36E-06
-7.10E-05
6.84E-05
3.80E-05
7.58E-05
7.96E-06
1.20E-06
-2.37E-05
-5.68E-06
-5.19E-05
-2.67E-05
2.82E-05
24-hr
168-hr
Dose (krad(Si))
Anneal
Anneal
20
30
50
60
70
1.22E-05 1.88E-05 2.64E-05 2.84E-05 2.20E-05
-5.66E-05 -4.94E-05 -3.21E-05 -3.25E-05 -4.23E-05
7.91E-05 8.61E-05 1.01E-04 9.96E-05 8.91E-05
5.03E-05 5.79E-05 8.11E-05 8.27E-05 6.76E-05
8.61E-05 9.09E-05 1.11E-04 1.12E-04 8.32E-05
1.67E-05 2.45E-05 4.37E-05 4.39E-05 1.70E-05
1.69E-05 2.79E-05 5.30E-05 5.29E-05 1.19E-05
-1.32E-05 -4.23E-06 1.65E-05 1.68E-05 -1.90E-05
4.10E-06 1.11E-05 3.40E-05 3.25E-05 4.22E-06
-4.43E-05 -4.18E-05 -2.08E-05 -2.07E-05 -4.85E-05
-2.62E-05 -2.60E-05 -2.63E-05 -2.54E-05 -2.51E-05
2.78E-05 2.84E-05 2.82E-05 2.76E-05 2.84E-05
1.00E-05 2.37E-05 3.42E-05 4.09E-05 5.74E-05 5.80E-05 4.39E-05
5.24E-05 5.95E-05 5.85E-05 5.80E-05 5.97E-05 5.97E-05 5.49E-05
2.55E-04 3.01E-04 3.07E-04 3.12E-04 3.36E-04 3.37E-04 3.00E-04
-2.35E-04 -2.54E-04 -2.39E-04 -2.30E-04 -2.21E-04 -2.21E-04 -2.12E-04
-2.61E-05
2.42E-05
8.67E-05
-1.39E-04
-3.00E-04
PASS
3.00E-04
PASS
-1.44E-05
2.40E-05
9.77E-05
-1.27E-04
-4.50E-04
PASS
4.50E-04
PASS
-3.96E-06
2.57E-05
1.16E-04
-1.24E-04
-4.50E-04
PASS
4.50E-04
PASS
3.50E-06
2.83E-05
1.36E-04
-1.29E-04
-5.00E-04
PASS
5.00E-04
PASS
2.53E-05
2.91E-05
1.61E-04
-1.10E-04
-6.00E-04
PASS
6.00E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
20
2.51E-05
2.89E-05
1.60E-04
-1.10E-04
-6.00E-04
PASS
6.00E-04
PASS
-6.87E-06
2.71E-05
1.19E-04
-1.33E-04
-6.00E-04
PASS
6.00E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 1 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.7. Plot of Offset Current 1 @ +/-15V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.7. Raw data for Offset Current 1 @ +/-15V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 1 @ +/-15V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
4.00E-11
-1.80E-11
-1.40E-11
-7.70E-11
4.80E-11
4.00E-12
-1.18E-10
1.40E-11
2.00E-11
6.00E-12
-6.80E-11
4.10E-11
Total
10
6.90E-11
1.10E-11
-4.40E-11
7.00E-12
-2.30E-11
6.50E-11
-9.10E-11
7.20E-11
1.80E-11
3.10E-11
-6.50E-11
4.80E-11
Dose (krad(Si))
20
30
-3.00E-12 -5.10E-11
5.60E-11 1.64E-10
-4.30E-11 -8.70E-11
6.20E-11 6.80E-11
-6.50E-11 -1.40E-11
1.16E-10 1.27E-10
-1.20E-11 1.12E-10
3.70E-11 2.30E-11
-1.05E-10 -6.30E-11
3.20E-11 -3.30E-11
-6.40E-11 -3.90E-11
2.60E-11 5.20E-11
50
-1.41E-10
1.71E-10
4.20E-11
7.00E-11
-8.20E-11
3.12E-10
8.80E-11
6.30E-11
-9.50E-11
-5.10E-11
-3.90E-11
3.60E-11
24-hr
Anneal
60
-1.05E-10
1.63E-10
8.00E-12
5.00E-11
1.70E-11
2.58E-10
1.81E-10
6.10E-11
-4.20E-11
-6.30E-11
-3.50E-11
2.90E-11
168-hr
Anneal
70
-3.00E-11
1.43E-10
-6.10E-11
6.00E-11
1.14E-10
1.12E-10
3.80E-11
2.07E-10
4.50E-11
-4.30E-11
-5.40E-11
2.50E-11
-4.20E-12 4.00E-12 1.40E-12 1.60E-11 1.20E-11 2.66E-11 4.52E-11
5.07E-11 4.28E-11 5.71E-11 1.01E-10 1.24E-10 9.61E-11 8.87E-11
2.32E-10 2.04E-10 2.68E-10 4.86E-10 5.92E-10 4.75E-10 4.59E-10
-2.41E-10 -1.96E-10 -2.65E-10 -4.54E-10 -5.68E-10 -4.22E-10 -3.69E-10
-1.48E-11
5.80E-11
2.56E-10
-2.86E-10
-1.00E-08
PASS
1.00E-08
PASS
1.90E-11
6.55E-11
3.25E-10
-2.87E-10
-1.00E-08
PASS
1.00E-08
PASS
1.36E-11
8.08E-11
3.90E-10
-3.63E-10
-1.00E-08
PASS
1.00E-08
PASS
3.32E-11
8.48E-11
4.29E-10
-3.62E-10
-1.17E-08
PASS
1.17E-08
PASS
6.34E-11
1.59E-10
8.03E-10
-6.77E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
22
7.90E-11
1.39E-10
7.29E-10
-5.71E-10
-1.50E-08
PASS
1.50E-08
PASS
7.18E-11
9.35E-11
5.08E-10
-3.64E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 2 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.8. Plot of Offset Current 2 @ +/-15V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.8. Raw data for Offset Current 2 @ +/-15V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 2 @ +/-15V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-4.30E-11
2.30E-11
-1.40E-11
-4.40E-11
5.60E-11
-1.11E-10
2.60E-11
1.40E-11
-1.28E-10
-1.00E-11
-7.00E-12
6.60E-11
Total
10
-5.10E-11
6.00E-12
-1.60E-11
-1.32E-10
1.15E-10
-9.10E-11
1.06E-10
6.50E-11
-2.50E-11
1.40E-11
-2.40E-11
1.00E-10
24-hr
168-hr
Dose (krad(Si))
Anneal
Anneal
20
30
50
60
70
-3.70E-11 -8.90E-11 3.80E-11 5.10E-11 -5.30E-11
8.60E-11 6.10E-11 1.68E-10 1.24E-10 -7.00E-12
-1.30E-10 -1.30E-10 -9.50E-11 -1.34E-10 -1.10E-10
-1.58E-10 -5.30E-11 -6.20E-11 -1.70E-11 -8.90E-11
3.80E-11 2.90E-11 1.61E-10 1.67E-10 2.06E-10
-5.40E-11 5.60E-11 1.44E-10 1.56E-10 1.20E-10
3.30E-11 9.80E-11 8.90E-11 8.20E-11 1.16E-10
8.10E-11 1.62E-10 1.40E-10 8.40E-11 7.10E-11
8.80E-11 7.30E-11 1.77E-10 1.45E-10 1.38E-10
3.70E-11 5.00E-12 4.90E-11 2.00E-12 -6.00E-12
-5.20E-11 -1.60E-11 -2.90E-11 -3.30E-11 -1.70E-11
8.70E-11 8.80E-11 6.20E-11 8.40E-11 7.90E-11
-4.40E-12 -1.56E-11 -4.02E-11 -3.64E-11 4.20E-11 3.82E-11 -1.06E-11
4.34E-11 8.99E-11 1.05E-10 7.99E-11 1.22E-10 1.19E-10 1.27E-10
1.98E-10 4.04E-10 4.49E-10 3.37E-10 6.12E-10 5.94E-10 5.83E-10
-2.07E-10 -4.35E-10 -5.30E-10 -4.09E-10 -5.28E-10 -5.18E-10 -6.04E-10
-4.18E-11
7.24E-11
2.96E-10
-3.79E-10
-1.00E-08
PASS
1.00E-08
PASS
1.38E-11
7.68E-11
3.72E-10
-3.45E-10
-1.00E-08
PASS
1.00E-08
PASS
3.70E-11
5.66E-11
3.01E-10
-2.27E-10
-1.00E-08
PASS
1.00E-08
PASS
7.88E-11
5.76E-11
3.48E-10
-1.90E-10
-1.17E-08
PASS
1.17E-08
PASS
1.20E-10
5.06E-11
3.56E-10
-1.16E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
24
9.38E-11
6.15E-11
3.81E-10
-1.93E-10
-1.50E-08
PASS
1.50E-08
PASS
8.78E-11
5.79E-11
3.58E-10
-1.83E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 3 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.9. Plot of Offset Current 3 @ +/-15V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.9. Raw data for Offset Current 3 @ +/-15V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 3 @ +/-15V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.66E-10
0.00E+00
-3.90E-11
-8.10E-11
4.90E-11
-5.80E-11
-2.60E-11
-5.00E-11
6.20E-11
-3.10E-11
3.90E-11
7.20E-11
Total
10
-1.55E-10
1.10E-11
2.30E-11
-8.40E-11
5.90E-11
-4.30E-11
-5.00E-11
-6.90E-11
6.10E-11
1.30E-11
3.20E-11
6.80E-11
Dose (krad(Si))
20
30
-1.28E-10 -8.20E-11
5.80E-11 6.30E-11
-3.20E-11 -7.00E-11
-3.00E-12 -8.00E-12
6.90E-11 0.00E+00
4.00E-12 8.70E-11
-5.20E-11 -8.60E-11
-1.03E-10 -8.90E-11
1.19E-10 1.33E-10
2.00E-12 2.90E-11
1.80E-11 7.00E-12
4.30E-11 5.60E-11
50
1.72E-10
1.54E-10
-2.60E-11
-2.10E-11
-1.80E-11
1.59E-10
-1.50E-11
-6.50E-11
3.38E-10
1.82E-10
1.70E-11
6.00E-11
24-hr
Anneal
60
1.35E-10
1.68E-10
-9.40E-11
7.00E-12
-8.00E-11
2.19E-10
-6.80E-11
-7.10E-11
2.86E-10
1.38E-10
1.00E-11
8.50E-11
168-hr
Anneal
70
-7.40E-11
1.55E-10
-1.11E-10
-4.30E-11
1.20E-10
6.10E-11
-5.50E-11
-9.20E-11
2.04E-10
1.39E-10
1.40E-11
6.30E-11
-4.74E-11 -2.92E-11 -7.20E-12 -1.94E-11 5.22E-11 2.72E-11 9.40E-12
8.19E-11 8.80E-11 7.95E-11 5.87E-11 1.01E-10 1.20E-10 1.20E-10
3.35E-10 3.81E-10 3.64E-10 2.54E-10 5.25E-10 5.89E-10 5.69E-10
-4.29E-10 -4.40E-10 -3.78E-10 -2.93E-10 -4.21E-10 -5.35E-10 -5.51E-10
-2.06E-11
4.80E-11
2.03E-10
-2.45E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.76E-11
5.35E-11
2.32E-10
-2.67E-10
-1.00E-08
PASS
1.00E-08
PASS
-6.00E-12
8.26E-11
3.80E-10
-3.92E-10
-1.00E-08
PASS
1.00E-08
PASS
1.48E-11
1.00E-10
4.83E-10
-4.54E-10
-1.17E-08
PASS
1.17E-08
PASS
1.20E-10
1.62E-10
8.77E-10
-6.37E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
26
1.01E-10
1.64E-10
8.66E-10
-6.65E-10
-1.50E-08
PASS
1.50E-08
PASS
5.14E-11
1.25E-10
6.37E-10
-5.34E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 4 @ +/-15V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.10. Plot of Offset Current 4 @ +/-15V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.10. Raw data for Offset Current 4 @ +/-15V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 4 @ +/-15V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
2.00E-12
-8.30E-11
-1.19E-10
-8.00E-11
1.90E-11
-1.90E-11
9.00E-12
-2.30E-11
-5.70E-11
-3.70E-11
6.70E-11
2.90E-11
Total
10
1.30E-11
2.20E-11
-4.30E-11
-3.90E-11
-5.20E-11
4.90E-11
1.55E-10
-2.70E-11
-7.80E-11
-6.10E-11
8.10E-11
-1.00E-12
Dose (krad(Si))
20
30
1.74E-10 2.12E-10
6.50E-11 8.20E-11
-1.20E-11 6.90E-11
-7.00E-12 -1.00E-11
-1.32E-10 -6.70E-11
7.60E-11 1.75E-10
1.12E-10 1.67E-10
-1.50E-11 -5.30E-11
-8.70E-11 -9.90E-11
-3.20E-11 -1.20E-11
5.50E-11 5.70E-11
2.60E-11 -2.00E-12
50
2.43E-10
2.33E-10
1.84E-10
-2.10E-11
-8.10E-11
2.14E-10
4.08E-10
-6.50E-11
-2.56E-10
-4.60E-11
6.90E-11
2.20E-11
24-hr
168-hr
Anneal
Anneal
60
70
2.78E-10 1.88E-10
2.32E-10 6.70E-11
2.18E-10 2.09E-10
1.00E-11 8.10E-11
-8.90E-11 -1.13E-10
1.23E-10 1.19E-10
2.83E-10 2.22E-10
-1.53E-10 2.90E-11
-2.91E-10 -8.60E-11
-1.10E-10 -9.50E-11
6.20E-11 5.60E-11
3.50E-11 2.30E-11
-5.22E-11 -1.98E-11 1.76E-11 5.72E-11 1.12E-10 1.30E-10 8.64E-11
5.96E-11 3.45E-11 1.12E-10 1.06E-10 1.52E-10 1.60E-10 1.28E-10
2.26E-10 1.41E-10 5.42E-10 5.50E-10 8.19E-10 8.76E-10 6.84E-10
-3.30E-10 -1.81E-10 -5.07E-10 -4.36E-10 -5.96E-10 -6.17E-10 -5.11E-10
-2.54E-11
2.43E-11
8.80E-11
-1.39E-10
-1.00E-08
PASS
1.00E-08
PASS
7.60E-12
9.57E-11
4.54E-10
-4.39E-10
-1.00E-08
PASS
1.00E-08
PASS
1.08E-11
8.15E-11
3.91E-10
-3.69E-10
-1.00E-08
PASS
1.00E-08
PASS
3.56E-11
1.27E-10
6.30E-10
-5.59E-10
-1.17E-08
PASS
1.17E-08
PASS
5.10E-11
2.60E-10
1.27E-09
-1.16E-09
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
28
-2.96E-11
2.30E-10
1.04E-09
-1.10E-09
-1.50E-08
PASS
1.50E-08
PASS
3.78E-11
1.36E-10
6.71E-10
-5.95E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 1 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.11. Plot of Positive Bias Current 1 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
29
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Positive Bias Current 1 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 1 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.03E-08 1.26E-08 1.56E-08 1.81E-08 2.46E-08 2.48E-08 2.33E-08
1115 1.08E-08 1.30E-08 1.61E-08 1.86E-08 2.53E-08 2.54E-08 2.39E-08
1116 1.02E-08 1.25E-08 1.56E-08 1.81E-08 2.47E-08 2.48E-08 2.35E-08
1117 1.03E-08 1.25E-08 1.55E-08 1.80E-08 2.46E-08 2.47E-08 2.34E-08
1118 1.06E-08 1.29E-08 1.61E-08 1.86E-08 2.55E-08 2.55E-08 2.41E-08
1119 1.02E-08 1.18E-08 1.36E-08 1.52E-08 1.89E-08 1.89E-08 1.75E-08
1120 1.05E-08 1.20E-08 1.39E-08 1.54E-08 1.93E-08 1.92E-08 1.79E-08
1121 9.33E-09 1.09E-08 1.26E-08 1.40E-08 1.76E-08 1.76E-08 1.62E-08
1122 1.06E-08 1.22E-08 1.42E-08 1.57E-08 1.95E-08 1.95E-08 1.80E-08
1123 9.69E-09 1.13E-08 1.32E-08 1.46E-08 1.82E-08 1.82E-08 1.69E-08
1124 9.94E-09 9.88E-09 9.84E-09 9.93E-09 9.93E-09 9.95E-09 9.94E-09
1125 1.00E-08 9.97E-09 9.98E-09 1.00E-08 1.00E-08 1.01E-08 9.98E-09
Biased Statistics
Average Biased
1.04E-08 1.27E-08 1.58E-08 1.83E-08 2.49E-08 2.50E-08 2.36E-08
Std Dev Biased
2.31E-10 2.42E-10 2.92E-10 2.97E-10 4.28E-10 4.06E-10 3.56E-10
Ps99%/90% (+KTL) Biased
1.15E-08 1.38E-08 1.71E-08 1.97E-08 2.69E-08 2.69E-08 2.53E-08
Ps99%/90% (-KTL) Biased
9.37E-09 1.16E-08 1.44E-08 1.69E-08 2.29E-08 2.31E-08 2.20E-08
Un-Biased Statistics
Average Un-Biased
1.01E-08 1.16E-08 1.35E-08 1.50E-08 1.87E-08 1.87E-08 1.73E-08
Std Dev Un-Biased
5.31E-10 5.41E-10 6.23E-10 6.62E-10 7.78E-10 7.76E-10 7.49E-10
Ps99%/90% (+KTL) Un-Biased
1.25E-08 1.41E-08 1.64E-08 1.81E-08 2.24E-08 2.23E-08 2.08E-08
Ps99%/90% (-KTL) Un-Biased
7.58E-09 9.10E-09 1.06E-08 1.19E-08 1.51E-08 1.50E-08 1.38E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 2 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.12. Plot of Positive Bias Current 2 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
31
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Positive Bias Current 2 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 2 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.15E-08 1.41E-08 1.75E-08 2.04E-08 2.76E-08 2.77E-08 2.62E-08
1115 1.05E-08 1.29E-08 1.59E-08 1.86E-08 2.53E-08 2.55E-08 2.38E-08
1116 9.95E-09 1.22E-08 1.53E-08 1.77E-08 2.43E-08 2.44E-08 2.27E-08
1117 1.03E-08 1.26E-08 1.58E-08 1.82E-08 2.48E-08 2.49E-08 2.33E-08
1118 1.05E-08 1.29E-08 1.60E-08 1.85E-08 2.54E-08 2.54E-08 2.37E-08
1119 9.59E-09 1.12E-08 1.30E-08 1.44E-08 1.82E-08 1.82E-08 1.66E-08
1120 9.82E-09 1.14E-08 1.34E-08 1.48E-08 1.86E-08 1.86E-08 1.71E-08
1121 1.02E-08 1.18E-08 1.36E-08 1.51E-08 1.88E-08 1.88E-08 1.74E-08
1122 1.14E-08 1.31E-08 1.51E-08 1.68E-08 2.09E-08 2.09E-08 1.93E-08
1123 1.04E-08 1.21E-08 1.41E-08 1.57E-08 1.95E-08 1.95E-08 1.80E-08
1124 1.06E-08 1.06E-08 1.06E-08 1.07E-08 1.07E-08 1.06E-08 1.06E-08
1125 9.75E-09 9.72E-09 9.77E-09 9.75E-09 9.73E-09 9.72E-09 9.73E-09
Biased Statistics
Average Biased
1.05E-08 1.29E-08 1.61E-08 1.87E-08 2.55E-08 2.56E-08 2.39E-08
Std Dev Biased
5.90E-10 6.86E-10 8.15E-10 1.01E-09 1.26E-09 1.26E-09 1.34E-09
Ps99%/90% (+KTL) Biased
1.33E-08 1.61E-08 1.99E-08 2.34E-08 3.13E-08 3.15E-08 3.02E-08
Ps99%/90% (-KTL) Biased
7.79E-09 9.73E-09 1.23E-08 1.40E-08 1.96E-08 1.97E-08 1.77E-08
Un-Biased Statistics
Average Un-Biased
1.03E-08 1.19E-08 1.39E-08 1.54E-08 1.92E-08 1.92E-08 1.77E-08
Std Dev Un-Biased
6.93E-10 7.55E-10 7.93E-10 9.29E-10 1.05E-09 1.06E-09 1.03E-09
Ps99%/90% (+KTL) Un-Biased
1.35E-08 1.54E-08 1.76E-08 1.97E-08 2.41E-08 2.41E-08 2.25E-08
Ps99%/90% (-KTL) Un-Biased
7.06E-09 8.40E-09 1.02E-08 1.10E-08 1.43E-08 1.43E-08 1.29E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 3 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.13. Plot of Positive Bias Current 3 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
33
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Positive Bias Current 3 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 3 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.12E-08 1.37E-08 1.69E-08 1.97E-08 2.66E-08 2.67E-08 2.54E-08
1115 9.62E-09 1.18E-08 1.48E-08 1.73E-08 2.36E-08 2.37E-08 2.21E-08
1116 9.17E-09 1.12E-08 1.42E-08 1.66E-08 2.27E-08 2.28E-08 2.11E-08
1117 9.98E-09 1.22E-08 1.52E-08 1.77E-08 2.43E-08 2.44E-08 2.27E-08
1118 9.66E-09 1.19E-08 1.48E-08 1.73E-08 2.37E-08 2.38E-08 2.21E-08
1119 8.99E-09 1.04E-08 1.23E-08 1.36E-08 1.72E-08 1.71E-08 1.58E-08
1120 9.90E-09 1.16E-08 1.36E-08 1.50E-08 1.87E-08 1.87E-08 1.73E-08
1121 1.04E-08 1.21E-08 1.40E-08 1.55E-08 1.92E-08 1.92E-08 1.77E-08
1122 1.10E-08 1.27E-08 1.48E-08 1.64E-08 2.03E-08 2.02E-08 1.88E-08
1123 1.01E-08 1.16E-08 1.36E-08 1.51E-08 1.87E-08 1.86E-08 1.72E-08
1124 1.01E-08 1.01E-08 1.01E-08 1.01E-08 1.01E-08 1.01E-08 1.01E-08
1125 9.38E-09 9.36E-09 9.40E-09 9.35E-09 9.36E-09 9.42E-09 9.44E-09
Biased Statistics
Average Biased
9.93E-09 1.22E-08 1.52E-08 1.77E-08 2.42E-08 2.43E-08 2.27E-08
Std Dev Biased
7.75E-10 9.28E-10 1.02E-09 1.17E-09 1.45E-09 1.46E-09 1.61E-09
Ps99%/90% (+KTL) Biased
1.35E-08 1.65E-08 1.99E-08 2.32E-08 3.09E-08 3.11E-08 3.02E-08
Ps99%/90% (-KTL) Biased
6.31E-09 7.84E-09 1.04E-08 1.22E-08 1.74E-08 1.74E-08 1.52E-08
Un-Biased Statistics
Average Un-Biased
1.01E-08 1.17E-08 1.36E-08 1.51E-08 1.88E-08 1.88E-08 1.74E-08
Std Dev Un-Biased
7.44E-10 8.44E-10 9.13E-10 9.96E-10 1.11E-09 1.13E-09 1.07E-09
Ps99%/90% (+KTL) Un-Biased
1.36E-08 1.56E-08 1.79E-08 1.97E-08 2.40E-08 2.40E-08 2.24E-08
Ps99%/90% (-KTL) Un-Biased
6.61E-09 7.77E-09 9.38E-09 1.05E-08 1.36E-08 1.35E-08 1.23E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 4 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.14. Plot of Positive Bias Current 4 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
35
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Positive Bias Current 4 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 4 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.02E-08 1.24E-08 1.53E-08 1.78E-08 2.42E-08 2.44E-08 2.29E-08
1115 1.12E-08 1.33E-08 1.65E-08 1.92E-08 2.58E-08 2.60E-08 2.46E-08
1116 1.02E-08 1.24E-08 1.54E-08 1.81E-08 2.47E-08 2.47E-08 2.33E-08
1117 1.06E-08 1.29E-08 1.59E-08 1.86E-08 2.54E-08 2.55E-08 2.40E-08
1118 1.10E-08 1.34E-08 1.66E-08 1.93E-08 2.63E-08 2.64E-08 2.50E-08
1119 1.11E-08 1.27E-08 1.47E-08 1.62E-08 2.04E-08 2.03E-08 1.90E-08
1120 1.13E-08 1.29E-08 1.50E-08 1.66E-08 2.07E-08 2.07E-08 1.92E-08
1121 1.05E-08 1.20E-08 1.40E-08 1.55E-08 1.93E-08 1.95E-08 1.79E-08
1122 1.09E-08 1.26E-08 1.46E-08 1.61E-08 2.02E-08 2.02E-08 1.86E-08
1123 1.02E-08 1.18E-08 1.36E-08 1.50E-08 1.87E-08 1.87E-08 1.74E-08
1124 1.02E-08 1.02E-08 1.02E-08 1.03E-08 1.02E-08 1.02E-08 1.02E-08
1125 1.05E-08 1.04E-08 1.05E-08 1.05E-08 1.05E-08 1.04E-08 1.04E-08
Biased Statistics
Average Biased
1.06E-08 1.29E-08 1.60E-08 1.86E-08 2.53E-08 2.54E-08 2.40E-08
Std Dev Biased
4.32E-10 4.79E-10 6.01E-10 6.66E-10 8.49E-10 8.40E-10 8.70E-10
Ps99%/90% (+KTL) Biased
1.26E-08 1.51E-08 1.88E-08 2.17E-08 2.92E-08 2.93E-08 2.80E-08
Ps99%/90% (-KTL) Biased
8.62E-09 1.06E-08 1.32E-08 1.55E-08 2.13E-08 2.15E-08 1.99E-08
Un-Biased Statistics
Average Un-Biased
1.08E-08 1.24E-08 1.44E-08 1.59E-08 1.99E-08 1.99E-08 1.84E-08
Std Dev Un-Biased
4.49E-10 4.79E-10 5.62E-10 6.08E-10 8.15E-10 8.00E-10 7.75E-10
Ps99%/90% (+KTL) Un-Biased
1.29E-08 1.46E-08 1.70E-08 1.87E-08 2.37E-08 2.36E-08 2.20E-08
Ps99%/90% (-KTL) Un-Biased
8.68E-09 1.02E-08 1.18E-08 1.31E-08 1.60E-08 1.62E-08 1.48E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 1 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.15. Plot of Negative Bias Current 1 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
37
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for Negative Bias Current 1 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 1 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.04E-08 1.27E-08 1.56E-08 1.82E-08 2.46E-08 2.48E-08 2.33E-08
1115 1.07E-08 1.31E-08 1.62E-08 1.89E-08 2.55E-08 2.57E-08 2.41E-08
1116 1.02E-08 1.25E-08 1.56E-08 1.80E-08 2.48E-08 2.49E-08 2.35E-08
1117 1.03E-08 1.26E-08 1.57E-08 1.81E-08 2.47E-08 2.48E-08 2.35E-08
1118 1.07E-08 1.30E-08 1.61E-08 1.86E-08 2.55E-08 2.56E-08 2.43E-08
1119 1.02E-08 1.18E-08 1.38E-08 1.53E-08 1.93E-08 1.92E-08 1.77E-08
1120 1.04E-08 1.20E-08 1.40E-08 1.56E-08 1.95E-08 1.95E-08 1.80E-08
1121 9.44E-09 1.09E-08 1.27E-08 1.41E-08 1.77E-08 1.77E-08 1.64E-08
1122 1.06E-08 1.22E-08 1.41E-08 1.56E-08 1.95E-08 1.96E-08 1.81E-08
1123 9.74E-09 1.13E-08 1.32E-08 1.46E-08 1.82E-08 1.82E-08 1.69E-08
1124 9.89E-09 9.86E-09 9.86E-09 9.90E-09 9.87E-09 9.91E-09 9.88E-09
1125 1.01E-08 1.01E-08 1.01E-08 1.01E-08 1.01E-08 1.01E-08 1.01E-08
Biased Statistics
Average Biased
1.05E-08 1.28E-08 1.58E-08 1.84E-08 2.50E-08 2.52E-08 2.38E-08
Std Dev Biased
2.43E-10 2.54E-10 3.01E-10 3.90E-10 4.37E-10 4.74E-10 4.49E-10
Ps99%/90% (+KTL) Biased
1.16E-08 1.40E-08 1.72E-08 2.02E-08 2.70E-08 2.74E-08 2.58E-08
Ps99%/90% (-KTL) Biased
9.34E-09 1.16E-08 1.44E-08 1.65E-08 2.30E-08 2.29E-08 2.17E-08
Un-Biased Statistics
Average Un-Biased
1.01E-08 1.17E-08 1.36E-08 1.50E-08 1.89E-08 1.88E-08 1.74E-08
Std Dev Un-Biased
4.77E-10 5.41E-10 5.89E-10 6.68E-10 8.29E-10 8.20E-10 7.35E-10
Ps99%/90% (+KTL) Un-Biased
1.23E-08 1.42E-08 1.63E-08 1.82E-08 2.27E-08 2.27E-08 2.08E-08
Ps99%/90% (-KTL) Un-Biased
7.85E-09 9.15E-09 1.08E-08 1.19E-08 1.50E-08 1.50E-08 1.40E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 2 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.16. Plot of Negative Bias Current 2 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
39
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.16. Raw data for Negative Bias Current 2 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 2 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.15E-08 1.41E-08 1.75E-08 2.03E-08 2.77E-08 2.79E-08 2.63E-08
1115 1.05E-08 1.29E-08 1.61E-08 1.87E-08 2.55E-08 2.57E-08 2.39E-08
1116 9.98E-09 1.22E-08 1.53E-08 1.77E-08 2.43E-08 2.43E-08 2.27E-08
1117 1.03E-08 1.25E-08 1.57E-08 1.82E-08 2.49E-08 2.49E-08 2.33E-08
1118 1.06E-08 1.30E-08 1.60E-08 1.86E-08 2.55E-08 2.55E-08 2.40E-08
1119 9.50E-09 1.11E-08 1.31E-08 1.46E-08 1.84E-08 1.84E-08 1.68E-08
1120 9.89E-09 1.16E-08 1.35E-08 1.49E-08 1.88E-08 1.87E-08 1.73E-08
1121 1.03E-08 1.19E-08 1.38E-08 1.53E-08 1.90E-08 1.90E-08 1.75E-08
1122 1.13E-08 1.31E-08 1.53E-08 1.70E-08 2.12E-08 2.11E-08 1.95E-08
1123 1.05E-08 1.22E-08 1.42E-08 1.57E-08 1.96E-08 1.95E-08 1.81E-08
1124 1.06E-08 1.06E-08 1.06E-08 1.07E-08 1.06E-08 1.07E-08 1.06E-08
1125 9.88E-09 9.85E-09 9.84E-09 9.86E-09 9.82E-09 9.84E-09 9.84E-09
Biased Statistics
Average Biased
1.06E-08 1.29E-08 1.61E-08 1.87E-08 2.56E-08 2.57E-08 2.40E-08
Std Dev Biased
5.63E-10 6.85E-10 8.36E-10 9.76E-10 1.28E-09 1.36E-09 1.37E-09
Ps99%/90% (+KTL) Biased
1.32E-08 1.61E-08 2.00E-08 2.32E-08 3.15E-08 3.20E-08 3.04E-08
Ps99%/90% (-KTL) Biased
7.95E-09 9.74E-09 1.22E-08 1.41E-08 1.96E-08 1.93E-08 1.76E-08
Un-Biased Statistics
Average Un-Biased
1.03E-08 1.20E-08 1.40E-08 1.55E-08 1.94E-08 1.93E-08 1.78E-08
Std Dev Un-Biased
6.71E-10 7.60E-10 8.38E-10 9.13E-10 1.07E-09 1.07E-09 1.05E-09
Ps99%/90% (+KTL) Un-Biased
1.34E-08 1.55E-08 1.79E-08 1.98E-08 2.44E-08 2.43E-08 2.27E-08
Ps99%/90% (-KTL) Un-Biased
7.15E-09 8.43E-09 1.01E-08 1.12E-08 1.44E-08 1.44E-08 1.29E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 3 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.17. Plot of Negative Bias Current 3 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
41
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.17. Raw data for Negative Bias Current 3 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 3 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.11E-08 1.36E-08 1.68E-08 1.96E-08 2.68E-08 2.70E-08 2.54E-08
1115 9.64E-09 1.19E-08 1.48E-08 1.74E-08 2.38E-08 2.39E-08 2.22E-08
1116 9.12E-09 1.13E-08 1.42E-08 1.66E-08 2.27E-08 2.28E-08 2.11E-08
1117 9.90E-09 1.21E-08 1.52E-08 1.77E-08 2.44E-08 2.45E-08 2.28E-08
1118 9.74E-09 1.20E-08 1.49E-08 1.74E-08 2.37E-08 2.38E-08 2.23E-08
1119 8.95E-09 1.04E-08 1.23E-08 1.37E-08 1.74E-08 1.73E-08 1.59E-08
1120 9.94E-09 1.16E-08 1.35E-08 1.49E-08 1.88E-08 1.87E-08 1.73E-08
1121 1.04E-08 1.20E-08 1.40E-08 1.54E-08 1.92E-08 1.91E-08 1.77E-08
1122 1.11E-08 1.28E-08 1.50E-08 1.65E-08 2.07E-08 2.06E-08 1.89E-08
1123 1.01E-08 1.17E-08 1.36E-08 1.51E-08 1.89E-08 1.88E-08 1.74E-08
1124 1.02E-08 1.01E-08 1.02E-08 1.02E-08 1.02E-08 1.02E-08 1.01E-08
1125 9.45E-09 9.46E-09 9.47E-09 9.49E-09 9.48E-09 9.48E-09 9.48E-09
Biased Statistics
Average Biased
9.90E-09 1.22E-08 1.52E-08 1.77E-08 2.43E-08 2.44E-08 2.28E-08
Std Dev Biased
7.23E-10 8.48E-10 9.73E-10 1.14E-09 1.53E-09 1.57E-09 1.59E-09
Ps99%/90% (+KTL) Biased
1.33E-08 1.61E-08 1.97E-08 2.30E-08 3.14E-08 3.17E-08 3.02E-08
Ps99%/90% (-KTL) Biased
6.52E-09 8.22E-09 1.06E-08 1.24E-08 1.72E-08 1.71E-08 1.54E-08
Un-Biased Statistics
Average Un-Biased
1.01E-08 1.17E-08 1.37E-08 1.51E-08 1.90E-08 1.89E-08 1.74E-08
Std Dev Un-Biased
7.74E-10 8.75E-10 9.66E-10 1.02E-09 1.16E-09 1.16E-09 1.09E-09
Ps99%/90% (+KTL) Un-Biased
1.37E-08 1.58E-08 1.82E-08 1.99E-08 2.44E-08 2.43E-08 2.25E-08
Ps99%/90% (-KTL) Un-Biased
6.49E-09 7.63E-09 9.16E-09 1.04E-08 1.36E-08 1.35E-08 1.24E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 4 @ +/-15V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.18. Plot of Negative Bias Current 4 @ +/-15V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
43
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.18. Raw data for Negative Bias Current 4 @ +/-15V (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 4 @ +/-15V (A)
Device
0
10
20
30
50
60
70
1114 1.02E-08 1.24E-08 1.55E-08 1.80E-08 2.46E-08 2.47E-08 2.32E-08
1115 1.11E-08 1.35E-08 1.66E-08 1.93E-08 2.61E-08 2.62E-08 2.48E-08
1116 1.01E-08 1.24E-08 1.55E-08 1.81E-08 2.49E-08 2.51E-08 2.35E-08
1117 1.06E-08 1.29E-08 1.60E-08 1.86E-08 2.55E-08 2.56E-08 2.42E-08
1118 1.10E-08 1.34E-08 1.65E-08 1.93E-08 2.63E-08 2.64E-08 2.49E-08
1119 1.11E-08 1.27E-08 1.48E-08 1.65E-08 2.07E-08 2.06E-08 1.91E-08
1120 1.13E-08 1.31E-08 1.52E-08 1.68E-08 2.11E-08 2.10E-08 1.95E-08
1121 1.04E-08 1.20E-08 1.40E-08 1.55E-08 1.94E-08 1.93E-08 1.79E-08
1122 1.09E-08 1.26E-08 1.46E-08 1.62E-08 2.00E-08 2.00E-08 1.86E-08
1123 1.02E-08 1.17E-08 1.36E-08 1.51E-08 1.88E-08 1.87E-08 1.73E-08
1124 1.03E-08 1.03E-08 1.03E-08 1.03E-08 1.03E-08 1.03E-08 1.03E-08
1125 1.05E-08 1.05E-08 1.05E-08 1.05E-08 1.06E-08 1.06E-08 1.05E-08
Biased Statistics
Average Biased
1.06E-08 1.29E-08 1.60E-08 1.87E-08 2.55E-08 2.56E-08 2.41E-08
Std Dev Biased
4.62E-10 5.08E-10 5.41E-10 6.14E-10 7.46E-10 7.23E-10 7.43E-10
Ps99%/90% (+KTL) Biased
1.28E-08 1.53E-08 1.85E-08 2.15E-08 2.90E-08 2.90E-08 2.76E-08
Ps99%/90% (-KTL) Biased
8.46E-09 1.05E-08 1.35E-08 1.58E-08 2.20E-08 2.22E-08 2.07E-08
Un-Biased Statistics
Average Un-Biased
1.08E-08 1.24E-08 1.44E-08 1.60E-08 2.00E-08 1.99E-08 1.85E-08
Std Dev Un-Biased
4.68E-10 5.82E-10 6.31E-10 6.92E-10 9.54E-10 9.44E-10 8.78E-10
Ps99%/90% (+KTL) Un-Biased
1.30E-08 1.52E-08 1.74E-08 1.92E-08 2.45E-08 2.43E-08 2.26E-08
Ps99%/90% (-KTL) Un-Biased
8.59E-09 9.73E-09 1.15E-08 1.28E-08 1.56E-08 1.55E-08 1.44E-08
Specification MIN
-3.00E-08 -6.00E-08 -7.50E-08 -8.33E-08 -1.00E-07 -1.00E-07 -1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
3.00E-08 6.00E-08 7.50E-08 8.33E-08 1.00E-07 1.00E-07 1.00E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 1 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.19. Plot of Common Mode Rejection Ratio 1 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
45
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.19. Raw data for Common Mode Rejection Ratio 1 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 1 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.31E+02
1.12E+02
1.15E+02
1.15E+02
1.12E+02
1.17E+02
1.09E+02
1.06E+02
1.14E+02
1.08E+02
1.12E+02
1.09E+02
24-hr
Anneal
60
1.33E+02
1.12E+02
1.14E+02
1.15E+02
1.12E+02
1.16E+02
1.09E+02
1.06E+02
1.15E+02
1.09E+02
1.13E+02
1.09E+02
168-hr
Anneal
70
1.27E+02
1.13E+02
1.16E+02
1.16E+02
1.13E+02
1.18E+02
1.10E+02
1.06E+02
1.16E+02
1.09E+02
1.12E+02
1.09E+02
1.17E+02
7.17E+00
1.50E+02
8.35E+01
1.17E+02
8.14E+00
1.55E+02
7.90E+01
1.17E+02
8.66E+00
1.58E+02
7.69E+01
1.17E+02
5.84E+00
1.44E+02
8.96E+01
1.12E+02
4.87E+00
1.34E+02
8.90E+01
9.60E+01
PASS
1.11E+02
4.49E+00
1.32E+02
8.99E+01
9.40E+01
PASS
1.11E+02
4.44E+00
1.32E+02
9.01E+01
9.40E+01
PASS
1.12E+02
5.06E+00
1.36E+02
8.84E+01
9.40E+01
PASS
0
1.20E+02
1.16E+02
1.18E+02
1.20E+02
1.15E+02
1.28E+02
1.12E+02
1.07E+02
1.21E+02
1.11E+02
1.12E+02
1.09E+02
Total
10
1.27E+02
1.13E+02
1.15E+02
1.16E+02
1.13E+02
1.19E+02
1.11E+02
1.07E+02
1.18E+02
1.10E+02
1.12E+02
1.09E+02
Dose (krad(Si))
20
30
1.28E+02 1.29E+02
1.13E+02 1.12E+02
1.15E+02 1.15E+02
1.15E+02 1.16E+02
1.12E+02 1.12E+02
1.18E+02 1.17E+02
1.10E+02 1.10E+02
1.06E+02 1.06E+02
1.17E+02 1.16E+02
1.10E+02 1.09E+02
1.12E+02 1.12E+02
1.09E+02 1.09E+02
1.18E+02
2.50E+00
1.29E+02
1.06E+02
1.17E+02
5.87E+00
1.44E+02
8.93E+01
1.17E+02
6.50E+00
1.47E+02
8.63E+01
1.16E+02
8.42E+00
1.55E+02
7.63E+01
9.70E+01
PASS
1.13E+02
5.40E+00
1.38E+02
8.77E+01
9.70E+01
PASS
1.12E+02
5.10E+00
1.36E+02
8.84E+01
9.70E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 2 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.20. Plot of Common Mode Rejection Ratio 2 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
47
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.20. Raw data for Common Mode Rejection Ratio 2 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 2 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.14E+02
1.16E+02
1.20E+02
1.25E+02
1.16E+02
1.09E+02
1.10E+02
1.10E+02
1.12E+02
1.13E+02
1.15E+02
1.07E+02
24-hr
Anneal
60
1.14E+02
1.16E+02
1.20E+02
1.25E+02
1.16E+02
1.09E+02
1.10E+02
1.10E+02
1.12E+02
1.13E+02
1.15E+02
1.07E+02
168-hr
Anneal
70
1.15E+02
1.17E+02
1.21E+02
1.30E+02
1.17E+02
1.10E+02
1.11E+02
1.11E+02
1.13E+02
1.14E+02
1.15E+02
1.07E+02
1.19E+02
5.07E+00
1.43E+02
9.54E+01
1.18E+02
4.27E+00
1.38E+02
9.82E+01
1.18E+02
4.27E+00
1.38E+02
9.83E+01
1.20E+02
5.87E+00
1.47E+02
9.25E+01
1.12E+02
1.75E+00
1.20E+02
1.04E+02
9.60E+01
PASS
1.11E+02
1.67E+00
1.19E+02
1.03E+02
9.40E+01
PASS
1.11E+02
1.66E+00
1.19E+02
1.03E+02
9.40E+01
PASS
1.12E+02
1.84E+00
1.21E+02
1.03E+02
9.40E+01
PASS
0
1.19E+02
1.20E+02
1.27E+02
1.39E+02
1.19E+02
1.13E+02
1.13E+02
1.12E+02
1.16E+02
1.17E+02
1.15E+02
1.07E+02
Total
10
1.15E+02
1.17E+02
1.21E+02
1.29E+02
1.17E+02
1.11E+02
1.12E+02
1.12E+02
1.14E+02
1.16E+02
1.15E+02
1.07E+02
Dose (krad(Si))
20
30
1.15E+02 1.15E+02
1.16E+02 1.16E+02
1.20E+02 1.20E+02
1.27E+02 1.27E+02
1.16E+02 1.16E+02
1.10E+02 1.10E+02
1.11E+02 1.11E+02
1.11E+02 1.11E+02
1.13E+02 1.13E+02
1.15E+02 1.14E+02
1.15E+02 1.15E+02
1.07E+02 1.07E+02
1.25E+02
8.54E+00
1.65E+02
8.51E+01
1.20E+02
5.62E+00
1.46E+02
9.35E+01
1.19E+02
5.10E+00
1.43E+02
9.53E+01
1.14E+02
2.11E+00
1.24E+02
1.04E+02
9.70E+01
PASS
1.13E+02
1.92E+00
1.22E+02
1.04E+02
9.70E+01
PASS
1.12E+02
1.79E+00
1.20E+02
1.04E+02
9.70E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 3 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.21. Plot of Common Mode Rejection Ratio 3 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
49
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.21. Raw data for Common Mode Rejection Ratio 3 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 3 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.20E+02
1.16E+02
1.09E+02
1.22E+02
1.14E+02
1.13E+02
1.12E+02
1.14E+02
1.27E+02
1.16E+02
1.14E+02
1.21E+02
24-hr
Anneal
60
1.20E+02
1.16E+02
1.09E+02
1.22E+02
1.14E+02
1.13E+02
1.12E+02
1.14E+02
1.28E+02
1.15E+02
1.13E+02
1.22E+02
168-hr
Anneal
70
1.24E+02
1.18E+02
1.10E+02
1.25E+02
1.15E+02
1.15E+02
1.14E+02
1.15E+02
1.38E+02
1.18E+02
1.14E+02
1.21E+02
1.17E+02
5.28E+00
1.42E+02
9.23E+01
1.16E+02
4.98E+00
1.40E+02
9.31E+01
1.17E+02
5.11E+00
1.40E+02
9.27E+01
1.18E+02
6.22E+00
1.47E+02
8.94E+01
1.19E+02
8.68E+00
1.59E+02
7.80E+01
9.60E+01
PASS
1.16E+02
6.17E+00
1.45E+02
8.76E+01
9.40E+01
PASS
1.16E+02
6.58E+00
1.47E+02
8.57E+01
9.40E+01
PASS
1.20E+02
1.02E+01
1.68E+02
7.22E+01
9.40E+01
PASS
0
1.36E+02
1.20E+02
1.11E+02
1.38E+02
1.17E+02
1.19E+02
1.16E+02
1.17E+02
1.27E+02
1.21E+02
1.13E+02
1.21E+02
Total
10
1.21E+02
1.17E+02
1.10E+02
1.24E+02
1.15E+02
1.16E+02
1.15E+02
1.16E+02
1.40E+02
1.19E+02
1.13E+02
1.21E+02
Dose (krad(Si))
20
30
1.21E+02 1.21E+02
1.17E+02 1.17E+02
1.10E+02 1.10E+02
1.23E+02 1.23E+02
1.15E+02 1.15E+02
1.15E+02 1.14E+02
1.14E+02 1.13E+02
1.15E+02 1.15E+02
1.37E+02 1.34E+02
1.18E+02 1.17E+02
1.14E+02 1.13E+02
1.21E+02 1.21E+02
1.25E+02
1.18E+01
1.80E+02
6.95E+01
1.17E+02
5.49E+00
1.43E+02
9.18E+01
1.17E+02
5.35E+00
1.42E+02
9.21E+01
1.20E+02
4.30E+00
1.40E+02
1.00E+02
9.70E+01
PASS
1.21E+02
1.06E+01
1.71E+02
7.15E+01
9.70E+01
PASS
1.20E+02
1.00E+01
1.67E+02
7.29E+01
9.70E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Common Mode Rejection Ratio 4 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.22. Plot of Common Mode Rejection Ratio 4 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
51
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.22. Raw data for Common Mode Rejection Ratio 4 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Common Mode Rejection Ratio 4 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.15E+02
1.06E+02
1.12E+02
1.12E+02
1.09E+02
1.12E+02
1.09E+02
1.09E+02
1.08E+02
1.08E+02
1.13E+02
1.08E+02
24-hr
Anneal
60
1.15E+02
1.06E+02
1.13E+02
1.12E+02
1.09E+02
1.12E+02
1.09E+02
1.09E+02
1.08E+02
1.08E+02
1.13E+02
1.08E+02
168-hr
Anneal
70
1.16E+02
1.07E+02
1.13E+02
1.13E+02
1.10E+02
1.13E+02
1.10E+02
1.09E+02
1.08E+02
1.08E+02
1.13E+02
1.08E+02
1.11E+02
3.25E+00
1.26E+02
9.60E+01
1.11E+02
3.21E+00
1.26E+02
9.59E+01
1.11E+02
3.19E+00
1.26E+02
9.61E+01
1.12E+02
3.41E+00
1.27E+02
9.57E+01
1.10E+02
2.02E+00
1.19E+02
1.00E+02
9.60E+01
PASS
1.09E+02
1.96E+00
1.18E+02
9.99E+01
9.40E+01
PASS
1.09E+02
1.90E+00
1.18E+02
1.00E+02
9.40E+01
PASS
1.10E+02
2.05E+00
1.19E+02
1.00E+02
9.40E+01
PASS
0
1.17E+02
1.08E+02
1.15E+02
1.14E+02
1.11E+02
1.16E+02
1.11E+02
1.11E+02
1.10E+02
1.10E+02
1.13E+02
1.08E+02
Total
10
1.15E+02
1.07E+02
1.13E+02
1.13E+02
1.10E+02
1.14E+02
1.10E+02
1.10E+02
1.09E+02
1.09E+02
1.13E+02
1.08E+02
Dose (krad(Si))
20
30
1.15E+02 1.15E+02
1.06E+02 1.07E+02
1.13E+02 1.12E+02
1.12E+02 1.12E+02
1.10E+02 1.10E+02
1.13E+02 1.13E+02
1.10E+02 1.09E+02
1.10E+02 1.09E+02
1.08E+02 1.08E+02
1.09E+02 1.08E+02
1.13E+02 1.13E+02
1.08E+02 1.08E+02
1.13E+02
3.86E+00
1.31E+02
9.49E+01
1.11E+02
3.25E+00
1.27E+02
9.63E+01
1.11E+02
3.25E+00
1.26E+02
9.61E+01
1.12E+02
2.61E+00
1.24E+02
9.93E+01
9.70E+01
PASS
1.10E+02
2.11E+00
1.20E+02
1.01E+02
9.70E+01
PASS
1.10E+02
2.02E+00
1.19E+02
1.01E+02
9.70E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Power Supply Rejection Ratio 1 (dB)
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.23. Plot of Power Supply Rejection Ratio 1 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
53
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.23. Raw data for Power Supply Rejection Ratio 1 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 1 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.41E+02
1.29E+02
1.20E+02
1.29E+02
1.21E+02
1.22E+02
1.31E+02
1.24E+02
1.48E+02
1.28E+02
1.47E+02
1.31E+02
24-hr
Anneal
60
1.40E+02
1.27E+02
1.20E+02
1.32E+02
1.21E+02
1.21E+02
1.29E+02
1.22E+02
1.80E+02
1.27E+02
1.39E+02
1.29E+02
168-hr
Anneal
70
1.43E+02
1.25E+02
1.20E+02
1.32E+02
1.23E+02
1.20E+02
1.46E+02
1.25E+02
1.38E+02
1.34E+02
1.43E+02
1.31E+02
1.29E+02
7.88E+00
1.66E+02
9.22E+01
1.28E+02
8.37E+00
1.67E+02
8.89E+01
1.28E+02
8.30E+00
1.67E+02
8.91E+01
1.29E+02
9.20E+00
1.71E+02
8.56E+01
1.30E+02
7.66E+00
1.65E+02
9.38E+01
9.67E+01
PASS
1.31E+02
1.03E+01
1.79E+02
8.25E+01
9.40E+01
PASS
1.36E+02
2.51E+01
2.53E+02
1.86E+01
9.40E+01
PASS
1.32E+02
1.04E+01
1.81E+02
8.39E+01
9.40E+01
PASS
0
1.58E+02
1.25E+02
1.22E+02
1.46E+02
1.25E+02
1.20E+02
1.61E+02
1.25E+02
1.30E+02
1.32E+02
1.52E+02
1.30E+02
Total
10
1.56E+02
1.26E+02
1.21E+02
1.36E+02
1.23E+02
1.21E+02
1.37E+02
1.24E+02
1.33E+02
1.33E+02
1.37E+02
1.31E+02
Dose (krad(Si))
20
30
1.55E+02 1.39E+02
1.28E+02 1.26E+02
1.21E+02 1.22E+02
1.32E+02 1.35E+02
1.23E+02 1.23E+02
1.23E+02 1.21E+02
1.34E+02 1.35E+02
1.24E+02 1.23E+02
1.39E+02 1.39E+02
1.30E+02 1.28E+02
1.46E+02 1.37E+02
1.29E+02 1.33E+02
1.35E+02
1.60E+01
2.10E+02
6.07E+01
1.32E+02
1.46E+01
2.00E+02
6.40E+01
1.32E+02
1.38E+01
1.96E+02
6.72E+01
1.33E+02
1.59E+01
2.08E+02
5.88E+01
1.00E+02
PASS
1.30E+02
6.72E+00
1.61E+02
9.84E+01
1.00E+02
PASS
1.30E+02
6.91E+00
1.62E+02
9.79E+01
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Power Supply Rejection Ratio 2 (dB)
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.24. Plot of Power Supply Rejection Ratio 2 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
55
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.24. Raw data for Power Supply Rejection Ratio 2 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 2 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.27E+02
1.37E+02
1.39E+02
1.20E+02
1.21E+02
1.36E+02
1.29E+02
1.27E+02
1.27E+02
1.36E+02
1.32E+02
1.27E+02
24-hr
Anneal
60
1.27E+02
1.36E+02
1.43E+02
1.20E+02
1.20E+02
1.38E+02
1.31E+02
1.28E+02
1.27E+02
1.39E+02
1.33E+02
1.29E+02
168-hr
Anneal
70
1.30E+02
1.34E+02
1.44E+02
1.20E+02
1.20E+02
1.64E+02
1.27E+02
1.24E+02
1.25E+02
1.52E+02
1.33E+02
1.27E+02
1.27E+02
6.92E+00
1.60E+02
9.52E+01
1.29E+02
8.75E+00
1.70E+02
8.80E+01
1.29E+02
9.90E+00
1.75E+02
8.31E+01
1.29E+02
1.00E+01
1.76E+02
8.26E+01
1.34E+02
1.00E+01
1.81E+02
8.74E+01
9.67E+01
PASS
1.31E+02
4.52E+00
1.52E+02
1.10E+02
9.40E+01
PASS
1.33E+02
5.47E+00
1.58E+02
1.07E+02
9.40E+01
PASS
1.38E+02
1.82E+01
2.23E+02
5.37E+01
9.40E+01
PASS
0
1.34E+02
1.32E+02
1.30E+02
1.19E+02
1.19E+02
1.40E+02
1.26E+02
1.25E+02
1.25E+02
1.54E+02
1.34E+02
1.28E+02
Total
10
1.30E+02
1.36E+02
1.36E+02
1.20E+02
1.20E+02
1.50E+02
1.28E+02
1.26E+02
1.25E+02
1.56E+02
1.34E+02
1.28E+02
Dose (krad(Si))
20
30
1.30E+02 1.29E+02
1.37E+02 1.33E+02
1.36E+02 1.35E+02
1.21E+02 1.20E+02
1.20E+02 1.20E+02
1.42E+02 1.47E+02
1.29E+02 1.29E+02
1.26E+02 1.26E+02
1.27E+02 1.26E+02
1.82E+02 1.43E+02
1.35E+02 1.34E+02
1.29E+02 1.28E+02
1.27E+02
7.27E+00
1.61E+02
9.30E+01
1.28E+02
7.96E+00
1.65E+02
9.11E+01
1.29E+02
8.14E+00
1.67E+02
9.07E+01
1.34E+02
1.27E+01
1.93E+02
7.47E+01
1.00E+02
PASS
1.37E+02
1.48E+01
2.06E+02
6.80E+01
1.00E+02
PASS
1.41E+02
2.38E+01
2.52E+02
3.01E+01
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Power Supply Rejection Ratio 3 (dB)
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.25. Plot of Power Supply Rejection Ratio 3 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
57
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.25. Raw data for Power Supply Rejection Ratio 3 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 3 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.32E+02
1.20E+02
1.69E+02
1.25E+02
1.22E+02
1.28E+02
1.25E+02
1.63E+02
1.19E+02
1.40E+02
1.33E+02
1.19E+02
24-hr
Anneal
60
1.31E+02
1.21E+02
1.41E+02
1.25E+02
1.22E+02
1.27E+02
1.25E+02
1.52E+02
1.19E+02
1.38E+02
1.31E+02
1.20E+02
168-hr
Anneal
70
1.28E+02
1.19E+02
1.43E+02
1.24E+02
1.20E+02
1.25E+02
1.27E+02
1.39E+02
1.19E+02
1.42E+02
1.34E+02
1.20E+02
1.33E+02
2.07E+01
2.29E+02
3.60E+01
1.34E+02
2.02E+01
2.28E+02
3.95E+01
1.28E+02
8.23E+00
1.66E+02
8.93E+01
1.27E+02
9.84E+00
1.73E+02
8.10E+01
1.33E+02
1.28E+01
1.93E+02
7.36E+01
9.67E+01
PASS
1.35E+02
1.74E+01
2.16E+02
5.38E+01
9.40E+01
PASS
1.32E+02
1.28E+01
1.92E+02
7.25E+01
9.40E+01
PASS
1.30E+02
9.83E+00
1.76E+02
8.44E+01
9.40E+01
PASS
0
1.27E+02
1.20E+02
1.34E+02
1.22E+02
1.21E+02
1.26E+02
1.32E+02
1.33E+02
1.18E+02
1.46E+02
1.34E+02
1.20E+02
Total
10
1.29E+02
1.21E+02
1.49E+02
1.23E+02
1.20E+02
1.28E+02
1.28E+02
1.37E+02
1.18E+02
1.38E+02
1.30E+02
1.20E+02
Dose (krad(Si))
20
30
1.29E+02 1.30E+02
1.21E+02 1.20E+02
1.55E+02 1.69E+02
1.25E+02 1.23E+02
1.21E+02 1.21E+02
1.28E+02 1.28E+02
1.28E+02 1.27E+02
1.34E+02 1.44E+02
1.19E+02 1.19E+02
1.63E+02 1.49E+02
1.33E+02 1.34E+02
1.20E+02 1.20E+02
1.25E+02
6.15E+00
1.54E+02
9.61E+01
1.28E+02
1.20E+01
1.84E+02
7.21E+01
1.30E+02
1.43E+01
1.97E+02
6.36E+01
1.31E+02
1.03E+01
1.79E+02
8.30E+01
1.00E+02
PASS
1.30E+02
8.14E+00
1.68E+02
9.19E+01
1.00E+02
PASS
1.35E+02
1.70E+01
2.14E+02
5.55E+01
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Power Supply Rejection Ratio 4 (dB)
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.26. Plot of Power Supply Rejection Ratio 4 (dB) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
59
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.26. Raw data for Power Supply Rejection Ratio 4 (dB) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Power Supply Rejection Ratio 4 (dB)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
1.19E+02
1.27E+02
1.23E+02
1.33E+02
1.25E+02
1.34E+02
1.33E+02
1.22E+02
1.21E+02
1.34E+02
1.32E+02
1.30E+02
24-hr
Anneal
60
1.19E+02
1.27E+02
1.23E+02
1.35E+02
1.24E+02
1.32E+02
1.37E+02
1.21E+02
1.20E+02
1.33E+02
1.32E+02
1.28E+02
168-hr
Anneal
70
1.18E+02
1.29E+02
1.23E+02
1.34E+02
1.26E+02
1.28E+02
1.27E+02
1.23E+02
1.21E+02
1.46E+02
1.32E+02
1.27E+02
1.26E+02
6.39E+00
1.56E+02
9.66E+01
1.25E+02
5.27E+00
1.50E+02
1.01E+02
1.26E+02
5.95E+00
1.53E+02
9.78E+01
1.26E+02
6.11E+00
1.54E+02
9.73E+01
1.29E+02
7.46E+00
1.64E+02
9.42E+01
9.67E+01
PASS
1.29E+02
6.85E+00
1.61E+02
9.67E+01
9.40E+01
PASS
1.29E+02
7.65E+00
1.64E+02
9.29E+01
9.40E+01
PASS
1.29E+02
9.95E+00
1.75E+02
8.25E+01
9.40E+01
PASS
0
1.18E+02
1.30E+02
1.22E+02
1.50E+02
1.27E+02
1.29E+02
1.25E+02
1.24E+02
1.22E+02
1.55E+02
1.32E+02
1.27E+02
Total
10
1.19E+02
1.27E+02
1.24E+02
1.40E+02
1.28E+02
1.32E+02
1.29E+02
1.24E+02
1.22E+02
1.52E+02
1.29E+02
1.27E+02
Dose (krad(Si))
20
30
1.19E+02 1.19E+02
1.26E+02 1.28E+02
1.24E+02 1.23E+02
1.35E+02 1.36E+02
1.27E+02 1.26E+02
1.35E+02 1.31E+02
1.28E+02 1.30E+02
1.24E+02 1.23E+02
1.21E+02 1.21E+02
1.43E+02 1.40E+02
1.33E+02 1.33E+02
1.27E+02 1.28E+02
1.29E+02
1.24E+01
1.87E+02
7.14E+01
1.28E+02
7.53E+00
1.63E+02
9.26E+01
1.26E+02
5.82E+00
1.53E+02
9.88E+01
1.31E+02
1.36E+01
1.95E+02
6.76E+01
1.00E+02
PASS
1.32E+02
1.23E+01
1.89E+02
7.44E+01
1.00E+02
PASS
1.30E+02
8.93E+00
1.72E+02
8.86E+01
9.80E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Open Loop Gain 1 RL=10k VO=+/-10V (V/mV)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
6.00E+04
5.00E+04
4.00E+04
3.00E+04
2.00E+04
1.00E+04
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.27. Plot of Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
61
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.27. Raw data for Open Loop Gain 1 RL=10k VO=+/-10V (V/mV) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Open Loop Gain 1 RL=10k VO=+/-10V (V/mV)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
3.99E+04
5.86E+04
5.11E+04
5.46E+04
4.51E+04
4.56E+04
4.69E+04
4.53E+04
4.21E+04
4.52E+04
4.97E+04
4.65E+04
24-hr
Anneal
60
4.87E+04
3.73E+04
4.96E+04
5.87E+04
4.60E+04
4.54E+04
5.12E+04
4.94E+04
4.72E+04
3.93E+04
5.78E+04
5.45E+04
168-hr
Anneal
70
5.04E+04
3.97E+04
5.43E+04
5.34E+04
4.02E+04
5.52E+04
4.31E+04
5.14E+04
4.75E+04
5.37E+04
5.96E+04
4.66E+04
5.25E+04
3.53E+03
6.90E+04
3.60E+04
4.99E+04
7.46E+03
8.47E+04
1.51E+04
4.80E+04
7.67E+03
8.38E+04
1.23E+04
4.76E+04
7.14E+03
8.09E+04
1.43E+04
5.52E+04
1.96E+03
6.43E+04
4.60E+04
1.67E+02
PASS
4.50E+04
1.79E+03
5.34E+04
3.67E+04
1.00E+02
PASS
4.65E+04
4.58E+03
6.79E+04
2.51E+04
1.00E+02
PASS
5.02E+04
4.91E+03
7.31E+04
2.73E+04
1.00E+02
PASS
0
4.71E+04
4.88E+04
4.73E+04
6.24E+04
6.01E+04
6.30E+04
6.23E+04
4.47E+04
4.30E+04
4.88E+04
5.44E+04
5.11E+04
Total
10
6.15E+04
5.58E+04
4.27E+04
3.99E+04
4.81E+04
5.62E+04
5.85E+04
4.38E+04
5.72E+04
5.41E+04
4.40E+04
4.85E+04
Dose (krad(Si))
20
30
5.99E+04 4.91E+04
4.44E+04 5.52E+04
6.67E+04 5.05E+04
6.36E+04 5.04E+04
4.77E+04 5.73E+04
4.74E+04 5.40E+04
5.31E+04 5.25E+04
4.35E+04 5.53E+04
5.09E+04 5.71E+04
5.30E+04 5.70E+04
6.78E+04 4.84E+04
5.04E+04 5.02E+04
5.31E+04
7.48E+03
8.80E+04
1.83E+04
4.96E+04
9.00E+03
9.16E+04
7.59E+03
5.64E+04
9.89E+03
1.03E+05
1.03E+04
5.24E+04
9.62E+03
9.73E+04
7.51E+03
1.20E+03
PASS
5.40E+04
5.91E+03
8.15E+04
2.64E+04
5.00E+02
PASS
4.96E+04
4.10E+03
6.87E+04
3.05E+04
2.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Open Loop Gain 2 RL=10k VO=+/-10V (V/mV)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
7.00E+04
6.00E+04
5.00E+04
4.00E+04
3.00E+04
2.00E+04
1.00E+04
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.28. Plot of Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
63
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.28. Raw data for Open Loop Gain 2 RL=10k VO=+/-10V (V/mV) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Open Loop Gain 2 RL=10k VO=+/-10V (V/mV)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
5.64E+04
5.41E+04
4.92E+04
4.96E+04
5.98E+04
4.86E+04
4.33E+04
5.05E+04
4.54E+04
6.31E+04
5.16E+04
6.38E+04
24-hr
Anneal
60
6.50E+04
5.94E+04
4.63E+04
5.12E+04
4.37E+04
5.64E+04
4.23E+04
4.91E+04
4.92E+04
4.81E+04
5.62E+04
6.11E+04
168-hr
Anneal
70
4.17E+04
5.29E+04
4.96E+04
5.69E+04
5.78E+04
4.90E+04
4.73E+04
5.43E+04
6.79E+04
5.58E+04
4.98E+04
7.09E+04
5.76E+04
3.77E+03
7.52E+04
4.00E+04
5.38E+04
4.53E+03
7.50E+04
3.27E+04
5.31E+04
8.95E+03
9.49E+04
1.14E+04
5.18E+04
6.49E+03
8.21E+04
2.15E+04
5.21E+04
3.03E+03
6.63E+04
3.80E+04
1.67E+02
PASS
5.02E+04
7.72E+03
8.62E+04
1.41E+04
1.00E+02
PASS
4.90E+04
5.04E+03
7.25E+04
2.55E+04
1.00E+02
PASS
5.49E+04
8.11E+03
9.27E+04
1.70E+04
1.00E+02
PASS
0
5.25E+04
5.95E+04
6.47E+04
6.33E+04
4.87E+04
5.00E+04
6.84E+04
6.51E+04
5.87E+04
4.82E+04
5.67E+04
7.21E+04
Total
10
5.74E+04
7.60E+04
6.20E+04
5.43E+04
7.11E+04
4.94E+04
5.06E+04
5.85E+04
5.58E+04
6.20E+04
5.65E+04
5.41E+04
Dose (krad(Si))
20
30
5.01E+04 5.33E+04
5.37E+04 5.73E+04
6.95E+04 5.47E+04
6.09E+04 6.23E+04
4.92E+04 6.03E+04
6.22E+04 5.49E+04
4.06E+04 4.84E+04
4.66E+04 5.41E+04
4.71E+04 5.40E+04
4.36E+04 4.93E+04
5.29E+04 5.36E+04
5.82E+04 6.58E+04
5.77E+04
6.94E+03
9.01E+04
2.53E+04
6.42E+04
9.16E+03
1.07E+05
2.15E+04
5.67E+04
8.50E+03
9.63E+04
1.70E+04
5.81E+04
8.94E+03
9.98E+04
1.64E+04
1.20E+03
PASS
5.53E+04
5.32E+03
8.01E+04
3.05E+04
5.00E+02
PASS
4.80E+04
8.36E+03
8.70E+04
9.05E+03
2.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Open Loop Gain 3 RL=10k VO=+/-10V (V/mV)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
7.00E+04
6.00E+04
5.00E+04
4.00E+04
3.00E+04
2.00E+04
1.00E+04
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.29. Plot of Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
65
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.29. Raw data for Open Loop Gain 3 RL=10k VO=+/-10V (V/mV) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Open Loop Gain 3 RL=10k VO=+/-10V (V/mV)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
5.79E+04
5.50E+04
5.04E+04
6.97E+04
5.46E+04
4.69E+04
4.60E+04
4.78E+04
5.22E+04
4.61E+04
5.27E+04
6.63E+04
24-hr
Anneal
60
4.34E+04
5.59E+04
5.32E+04
4.32E+04
5.51E+04
4.07E+04
6.06E+04
5.79E+04
4.73E+04
5.23E+04
5.41E+04
6.24E+04
168-hr
Anneal
70
4.45E+04
5.12E+04
4.91E+04
4.65E+04
4.25E+04
5.44E+04
4.73E+04
4.89E+04
5.57E+04
5.18E+04
5.23E+04
5.80E+04
5.39E+04
4.69E+03
7.57E+04
3.20E+04
5.76E+04
7.31E+03
9.17E+04
2.34E+04
5.02E+04
6.34E+03
7.98E+04
2.06E+04
4.68E+04
3.46E+03
6.29E+04
3.06E+04
4.96E+04
4.55E+03
7.08E+04
2.84E+04
1.67E+02
PASS
4.78E+04
2.57E+03
5.98E+04
3.58E+04
1.00E+02
PASS
5.18E+04
8.02E+03
8.92E+04
1.44E+04
1.00E+02
PASS
5.16E+04
3.58E+03
6.83E+04
3.49E+04
1.00E+02
PASS
0
4.95E+04
5.54E+04
4.92E+04
5.11E+04
6.18E+04
5.37E+04
5.94E+04
6.41E+04
6.65E+04
4.78E+04
5.30E+04
5.45E+04
Total
10
4.99E+04
5.38E+04
6.46E+04
5.50E+04
6.04E+04
4.93E+04
4.85E+04
4.82E+04
4.84E+04
5.97E+04
3.86E+04
5.40E+04
Dose (krad(Si))
20
30
5.46E+04 6.15E+04
5.14E+04 5.46E+04
5.10E+04 5.30E+04
5.57E+04 5.03E+04
6.73E+04 4.99E+04
5.59E+04 5.57E+04
5.52E+04 4.72E+04
5.70E+04 4.64E+04
6.14E+04 4.55E+04
5.21E+04 5.31E+04
5.18E+04 4.67E+04
5.90E+04 5.57E+04
5.34E+04
5.30E+03
7.81E+04
2.86E+04
5.67E+04
5.78E+03
8.37E+04
2.98E+04
5.60E+04
6.65E+03
8.70E+04
2.50E+04
5.83E+04
7.64E+03
9.39E+04
2.26E+04
1.20E+03
PASS
5.08E+04
4.96E+03
7.40E+04
2.76E+04
5.00E+02
PASS
5.63E+04
3.38E+03
7.21E+04
4.05E+04
2.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Open Loop Gain 4 RL=10k VO=+/-10V (V/mV)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
7.00E+04
6.00E+04
5.00E+04
4.00E+04
3.00E+04
2.00E+04
1.00E+04
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.30. Plot of Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
67
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.30. Raw data for Open Loop Gain 4 RL=10k VO=+/-10V (V/mV) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Open Loop Gain 4 RL=10k VO=+/-10V (V/mV)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
50
5.56E+04
4.49E+04
5.13E+04
5.04E+04
5.18E+04
4.61E+04
6.40E+04
5.51E+04
4.15E+04
5.22E+04
4.41E+04
5.16E+04
24-hr
Anneal
60
4.31E+04
5.86E+04
5.61E+04
5.41E+04
4.94E+04
5.91E+04
4.17E+04
4.49E+04
3.46E+04
4.38E+04
4.92E+04
6.20E+04
168-hr
Anneal
70
5.75E+04
4.90E+04
4.53E+04
4.53E+04
6.47E+04
5.35E+04
4.21E+04
5.37E+04
4.49E+04
5.35E+04
4.46E+04
4.99E+04
5.21E+04
8.11E+03
9.00E+04
1.43E+04
5.08E+04
3.87E+03
6.89E+04
3.27E+04
5.23E+04
6.13E+03
8.09E+04
2.37E+04
5.24E+04
8.49E+03
9.20E+04
1.28E+04
5.85E+04
4.07E+03
7.75E+04
3.95E+04
1.67E+02
PASS
5.18E+04
8.64E+03
9.21E+04
1.15E+04
1.00E+02
PASS
4.48E+04
8.93E+03
8.65E+04
3.15E+03
1.00E+02
PASS
4.95E+04
5.62E+03
7.58E+04
2.33E+04
1.00E+02
PASS
0
4.41E+04
5.06E+04
6.19E+04
4.50E+04
6.01E+04
6.11E+04
5.59E+04
5.41E+04
5.13E+04
5.59E+04
6.04E+04
7.02E+04
Total
10
6.10E+04
5.77E+04
5.43E+04
5.43E+04
5.23E+04
5.20E+04
5.74E+04
5.68E+04
4.86E+04
4.66E+04
5.94E+04
4.56E+04
Dose (krad(Si))
20
30
6.12E+04 4.78E+04
4.69E+04 5.42E+04
5.09E+04 4.06E+04
4.89E+04 6.13E+04
4.97E+04 5.68E+04
4.57E+04 5.86E+04
4.32E+04 5.25E+04
5.21E+04 5.78E+04
4.06E+04 6.39E+04
5.42E+04 5.95E+04
4.85E+04 5.17E+04
5.98E+04 5.30E+04
5.23E+04
8.32E+03
9.12E+04
1.35E+04
5.59E+04
3.45E+03
7.20E+04
3.98E+04
5.15E+04
5.60E+03
7.76E+04
2.54E+04
5.57E+04
3.58E+03
7.24E+04
3.90E+04
1.20E+03
PASS
5.23E+04
4.82E+03
7.48E+04
2.98E+04
5.00E+02
PASS
4.72E+04
5.81E+03
7.43E+04
2.00E+04
2.00E+02
PASS
An ISO 9001:2008 and DSCC Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 1 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.31. Plot of Positive Output Voltage 1 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
69
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.31. Raw data for Positive Output Voltage 1 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 1 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Total
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Dose (krad(Si))
20
30
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
24-hr
Anneal
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
168-hr
Anneal
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
5.03E-03 5.03E-03 5.08E-03 5.41E-03 5.36E-03 5.08E-03 5.10E-03
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
1.40E+01 1.40E+01 1.40E+01 1.40E+01 1.40E+01 1.40E+01 1.40E+01
1.41E+01
5.83E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
3.91E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
3.21E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
3.08E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
3.51E-03
1.41E+01
1.40E+01
1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
70
1.41E+01
3.21E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
3.42E-03
1.41E+01
1.40E+01
1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 2 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.32. Plot of Positive Output Voltage 2 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
71
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.32. Raw data for Positive Output Voltage 2 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 2 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Total
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Dose (krad(Si))
20
30
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
24-hr
Anneal
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
168-hr
Anneal
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
4.45E-03 4.90E-03 4.21E-03 4.60E-03 5.22E-03 4.60E-03 4.77E-03
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
1.41E+01
1.79E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
4.38E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
4.45E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
4.85E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
4.32E-03
1.41E+01
1.41E+01
1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
72
1.41E+01
4.38E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
4.15E-03
1.41E+01
1.41E+01
1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 3 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.33. Plot of Positive Output Voltage 3 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
73
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.33. Raw data for Positive Output Voltage 3 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 3 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Total
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Dose (krad(Si))
20
30
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
24-hr
Anneal
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
168-hr
Anneal
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
4.76E-03 4.66E-03 4.90E-03 4.49E-03 5.03E-03 4.36E-03 4.76E-03
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
1.40E+01 1.40E+01 1.40E+01 1.41E+01 1.40E+01 1.41E+01 1.40E+01
1.41E+01
2.39E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
4.76E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
5.18E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
5.22E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
4.98E-03
1.41E+01
1.40E+01
1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
74
1.41E+01
5.18E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
4.76E-03
1.41E+01
1.40E+01
1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Output Voltage 4 @ +/-15V (V)
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
1.26E+01
1.24E+01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.34. Plot of Positive Output Voltage 4 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
75
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.34. Raw data for Positive Output Voltage 4 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 4 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Total
10
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
Dose (krad(Si))
20
30
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
1.41E+01 1.41E+01
50
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
24-hr
Anneal
60
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
168-hr
Anneal
70
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
5.02E-03 4.66E-03 4.66E-03 5.02E-03 4.38E-03 4.67E-03 5.10E-03
1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01 1.41E+01
1.40E+01 1.41E+01 1.41E+01 1.40E+01 1.41E+01 1.41E+01 1.40E+01
1.41E+01
5.46E-03
1.41E+01
1.40E+01
1.25E+01
PASS
1.41E+01
3.32E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
2.97E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
3.16E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
2.95E-03
1.41E+01
1.41E+01
1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
76
1.41E+01
2.97E-03
1.41E+01
1.41E+01
1.25E+01
PASS
1.41E+01
2.86E-03
1.41E+01
1.41E+01
1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 1 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.35. Plot of Negative Output Voltage 1 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
77
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.35. Raw data for Negative Output Voltage 1 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Output Voltage 1 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
Total Dose (krad(Si))
10
20
30
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
168-hr
Anneal
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
1.41E-03 1.10E-03 1.10E-03 1.34E-03 1.34E-03 1.41E-03 1.10E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01
6.30E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.02E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.61E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.63E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
78
-1.44E+01
3.63E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.70E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.63E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 2 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.36. Plot of Negative Output Voltage 2 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
79
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.36. Raw data for Negative Output Voltage 2 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Output Voltage 2 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
Total Dose (krad(Si))
10
20
30
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
168-hr
Anneal
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
4.15E-03 4.10E-03 3.71E-03 3.71E-03 3.54E-03 4.15E-03 4.15E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01
3.74E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.47E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.90E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.90E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
80
-1.44E+01
4.58E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.67E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.90E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 3 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.37. Plot of Negative Output Voltage 3 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
81
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.37. Raw data for Negative Output Voltage 3 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Output Voltage 3 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
Total Dose (krad(Si))
10
20
30
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
168-hr
Anneal
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
4.12E-03 3.90E-03 4.58E-03 4.12E-03 4.15E-03 4.39E-03 4.32E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01
4.10E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.76E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.98E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.60E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
82
-1.44E+01
4.53E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.92E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
4.34E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Output Voltage 4 @ +/-15V (V)
-1.20E+01
-1.25E+01
-1.30E+01
-1.35E+01
-1.40E+01
-1.45E+01
-1.50E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.38. Plot of Negative Output Voltage 4 @ +/-15V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
83
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.38. Raw data for Negative Output Voltage 4 @ +/-15V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Output Voltage 4 @ +/-15V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
Total Dose (krad(Si))
10
20
30
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01
50
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
24-hr
Anneal
60
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
168-hr
Anneal
70
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
8.37E-04 1.10E-03 1.14E-03 1.30E-03 1.10E-03 1.48E-03 1.30E-03
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01 -1.44E+01
-1.44E+01
5.90E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
2.83E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.19E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.29E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
An ISO 9001:2008 and DSCC Certified Company
84
-1.44E+01
3.61E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.29E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
-1.44E+01
3.56E-03
-1.44E+01
-1.44E+01
-1.25E+01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 1 @ +/-15V (V/us)
5.00E-01
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.39. Plot of Positive Slew Rate 1 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
85
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.39. Raw data for Positive Slew Rate 1 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Slew Rate 1 @ +/-15V (V/us)
Device
0
10
20
30
50
60
70
1114 4.76E-01 4.70E-01 4.56E-01 4.65E-01 4.44E-01 4.44E-01 4.40E-01
1115 4.46E-01 4.40E-01 4.35E-01 4.32E-01 4.16E-01 4.24E-01 4.20E-01
1116 4.37E-01 4.37E-01 4.42E-01 4.38E-01 4.18E-01 4.23E-01 4.24E-01
1117 4.68E-01 4.65E-01 4.54E-01 4.52E-01 4.39E-01 4.37E-01 4.38E-01
1118 4.64E-01 4.68E-01 4.70E-01 4.62E-01 4.42E-01 4.38E-01 4.52E-01
1119 4.62E-01 4.54E-01 4.52E-01 4.41E-01 4.42E-01 4.35E-01 4.37E-01
1120 4.71E-01 4.48E-01 4.51E-01 4.48E-01 4.39E-01 4.34E-01 4.41E-01
1121 4.59E-01 4.61E-01 4.50E-01 4.48E-01 4.33E-01 4.41E-01 4.44E-01
1122 4.45E-01 4.43E-01 4.37E-01 4.31E-01 4.33E-01 4.27E-01 4.38E-01
1123 4.54E-01 4.55E-01 4.43E-01 4.43E-01 4.31E-01 4.31E-01 4.40E-01
1124 4.40E-01 4.45E-01 4.49E-01 4.49E-01 4.37E-01 4.38E-01 4.48E-01
1125 4.40E-01 4.46E-01 4.40E-01 4.37E-01 4.53E-01 4.45E-01 4.37E-01
Biased Statistics
Average Biased
4.58E-01 4.56E-01 4.51E-01 4.50E-01 4.32E-01 4.33E-01 4.35E-01
Std Dev Biased
1.62E-02 1.61E-02 1.35E-02 1.45E-02 1.36E-02 9.26E-03 1.29E-02
Ps99%/90% (+KTL) Biased
5.34E-01 5.31E-01 5.14E-01 5.17E-01 4.95E-01 4.76E-01 4.95E-01
Ps99%/90% (-KTL) Biased
3.83E-01 3.81E-01 3.88E-01 3.82E-01 3.68E-01 3.90E-01 3.74E-01
Un-Biased Statistics
Average Un-Biased
4.58E-01 4.52E-01 4.47E-01 4.42E-01 4.36E-01 4.34E-01 4.40E-01
Std Dev Un-Biased
9.63E-03 6.91E-03 6.43E-03 6.98E-03 4.67E-03 5.18E-03 2.74E-03
Ps99%/90% (+KTL) Un-Biased
5.03E-01 4.84E-01 4.77E-01 4.75E-01 4.57E-01 4.58E-01 4.53E-01
Ps99%/90% (-KTL) Un-Biased
4.13E-01 4.20E-01 4.17E-01 4.10E-01 4.14E-01 4.09E-01 4.27E-01
Specification MIN
2.00E-01 1.30E-01 1.20E-01 1.17E-01 1.10E-01 1.10E-01 1.10E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 2 @ +/-15V (V/us)
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.40. Plot of Positive Slew Rate 2 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
87
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.40. Raw data for Positive Slew Rate 2 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Slew Rate 2 @ +/-15V (V/us)
Device
0
10
20
30
50
60
70
1114 4.60E-01 4.64E-01 4.55E-01 4.65E-01 4.34E-01 4.39E-01 4.32E-01
1115 5.09E-01 5.06E-01 4.97E-01 4.95E-01 4.85E-01 4.95E-01 4.88E-01
1116 5.09E-01 4.97E-01 4.95E-01 4.78E-01 4.75E-01 4.72E-01 4.74E-01
1117 5.09E-01 5.00E-01 4.99E-01 4.92E-01 4.81E-01 4.79E-01 4.69E-01
1118 5.04E-01 4.96E-01 4.92E-01 4.88E-01 4.81E-01 4.76E-01 4.80E-01
1119 5.23E-01 5.14E-01 5.16E-01 5.03E-01 4.97E-01 4.90E-01 5.00E-01
1120 4.87E-01 4.92E-01 4.85E-01 4.84E-01 4.72E-01 4.66E-01 4.80E-01
1121 5.14E-01 5.12E-01 5.08E-01 4.90E-01 4.77E-01 4.80E-01 4.92E-01
1122 4.76E-01 4.77E-01 4.81E-01 4.65E-01 4.55E-01 4.52E-01 4.71E-01
1123 4.80E-01 4.86E-01 4.91E-01 4.81E-01 4.71E-01 4.74E-01 4.82E-01
1124 4.80E-01 4.87E-01 4.76E-01 4.84E-01 4.89E-01 4.78E-01 4.81E-01
1125 5.05E-01 5.09E-01 5.12E-01 5.14E-01 5.17E-01 5.17E-01 5.01E-01
Biased Statistics
Average Biased
4.98E-01 4.93E-01 4.88E-01 4.84E-01 4.71E-01 4.72E-01 4.69E-01
Std Dev Biased
2.15E-02 1.65E-02 1.84E-02 1.22E-02 2.11E-02 2.05E-02 2.17E-02
Ps99%/90% (+KTL) Biased
5.98E-01 5.69E-01 5.73E-01 5.41E-01 5.70E-01 5.68E-01 5.70E-01
Ps99%/90% (-KTL) Biased
3.98E-01 4.16E-01 4.02E-01 4.27E-01 3.73E-01 3.76E-01 3.68E-01
Un-Biased Statistics
Average Un-Biased
4.96E-01 4.96E-01 4.96E-01 4.85E-01 4.74E-01 4.72E-01 4.85E-01
Std Dev Un-Biased
2.12E-02 1.63E-02 1.51E-02 1.38E-02 1.51E-02 1.44E-02 1.12E-02
Ps99%/90% (+KTL) Un-Biased
5.95E-01 5.72E-01 5.67E-01 5.49E-01 5.45E-01 5.39E-01 5.37E-01
Ps99%/90% (-KTL) Un-Biased
3.97E-01 4.20E-01 4.26E-01 4.20E-01 4.04E-01 4.05E-01 4.33E-01
Specification MIN
2.00E-01 1.30E-01 1.20E-01 1.17E-01 1.10E-01 1.10E-01 1.10E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 3 @ +/-15V (V/us)
5.00E-01
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.41. Plot of Positive Slew Rate 3 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
89
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.41. Raw data for Positive Slew Rate 3 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Slew Rate 3 @ +/-15V (V/us)
Device
0
10
20
30
50
60
70
1114 4.38E-01 4.34E-01 4.32E-01 4.28E-01 4.12E-01 4.14E-01 4.13E-01
1115 4.85E-01 4.80E-01 4.83E-01 4.81E-01 4.57E-01 4.69E-01 4.65E-01
1116 4.79E-01 4.63E-01 4.70E-01 4.55E-01 4.43E-01 4.41E-01 4.40E-01
1117 4.78E-01 4.91E-01 4.68E-01 4.68E-01 4.46E-01 4.49E-01 4.47E-01
1118 4.79E-01 4.76E-01 4.71E-01 4.74E-01 4.50E-01 4.54E-01 4.53E-01
1119 5.01E-01 4.84E-01 4.73E-01 4.74E-01 4.53E-01 4.67E-01 4.68E-01
1120 4.65E-01 4.68E-01 4.51E-01 4.56E-01 4.44E-01 4.45E-01 4.49E-01
1121 4.75E-01 4.88E-01 4.80E-01 4.75E-01 4.69E-01 4.51E-01 4.69E-01
1122 4.53E-01 4.44E-01 4.46E-01 4.49E-01 4.25E-01 4.34E-01 4.37E-01
1123 4.66E-01 4.65E-01 4.59E-01 4.58E-01 4.59E-01 4.47E-01 4.52E-01
1124 4.55E-01 4.65E-01 4.62E-01 4.54E-01 4.57E-01 4.63E-01 4.58E-01
1125 4.77E-01 4.83E-01 4.86E-01 4.79E-01 4.81E-01 4.79E-01 4.82E-01
Biased Statistics
Average Biased
4.72E-01 4.69E-01 4.65E-01 4.61E-01 4.42E-01 4.45E-01 4.44E-01
Std Dev Biased
1.91E-02 2.19E-02 1.93E-02 2.09E-02 1.74E-02 2.03E-02 1.94E-02
Ps99%/90% (+KTL) Biased
5.61E-01 5.71E-01 5.55E-01 5.59E-01 5.23E-01 5.40E-01 5.34E-01
Ps99%/90% (-KTL) Biased
3.83E-01 3.67E-01 3.75E-01 3.64E-01 3.61E-01 3.51E-01 3.53E-01
Un-Biased Statistics
Average Un-Biased
4.72E-01 4.70E-01 4.62E-01 4.62E-01 4.50E-01 4.49E-01 4.55E-01
Std Dev Un-Biased
1.80E-02 1.75E-02 1.44E-02 1.15E-02 1.67E-02 1.20E-02 1.35E-02
Ps99%/90% (+KTL) Un-Biased
5.56E-01 5.51E-01 5.29E-01 5.16E-01 5.28E-01 5.05E-01 5.18E-01
Ps99%/90% (-KTL) Un-Biased
3.88E-01 3.88E-01 3.95E-01 4.09E-01 3.72E-01 3.93E-01 3.92E-01
Specification MIN
2.00E-01 1.30E-01 1.20E-01 1.17E-01 1.10E-01 1.10E-01 1.10E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Positive Slew Rate 4 @ +/-15V (V/us)
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.42. Plot of Positive Slew Rate 4 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
91
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.42. Raw data for Positive Slew Rate 4 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Slew Rate 4 @ +/-15V (V/us)
Device
0
10
20
30
50
60
70
1114 5.08E-01 5.00E-01 4.85E-01 4.86E-01 4.77E-01 4.73E-01 4.70E-01
1115 4.75E-01 4.59E-01 4.59E-01 4.56E-01 4.40E-01 4.54E-01 4.50E-01
1116 4.75E-01 4.67E-01 4.76E-01 4.62E-01 4.59E-01 4.51E-01 4.51E-01
1117 4.91E-01 4.77E-01 4.70E-01 4.76E-01 4.64E-01 4.60E-01 4.65E-01
1118 4.98E-01 4.97E-01 5.00E-01 4.88E-01 4.74E-01 4.60E-01 4.71E-01
1119 4.83E-01 4.81E-01 4.70E-01 4.63E-01 4.61E-01 4.68E-01 4.63E-01
1120 4.93E-01 4.86E-01 4.89E-01 4.71E-01 4.59E-01 4.74E-01 4.82E-01
1121 4.89E-01 4.83E-01 4.71E-01 4.67E-01 4.58E-01 4.52E-01 4.55E-01
1122 4.63E-01 4.69E-01 4.73E-01 4.65E-01 4.52E-01 4.53E-01 4.57E-01
1123 4.84E-01 4.86E-01 4.76E-01 4.73E-01 4.58E-01 4.59E-01 4.74E-01
1124 4.67E-01 4.75E-01 4.67E-01 4.75E-01 4.73E-01 4.73E-01 4.69E-01
1125 4.67E-01 4.70E-01 4.67E-01 4.65E-01 4.68E-01 4.68E-01 4.69E-01
Biased Statistics
Average Biased
4.89E-01 4.80E-01 4.78E-01 4.74E-01 4.63E-01 4.60E-01 4.61E-01
Std Dev Biased
1.45E-02 1.81E-02 1.55E-02 1.42E-02 1.47E-02 8.44E-03 1.02E-02
Ps99%/90% (+KTL) Biased
5.57E-01 5.64E-01 5.50E-01 5.40E-01 5.31E-01 4.99E-01 5.09E-01
Ps99%/90% (-KTL) Biased
4.22E-01 3.96E-01 4.06E-01 4.07E-01 3.94E-01 4.20E-01 4.14E-01
Un-Biased Statistics
Average Un-Biased
4.82E-01 4.81E-01 4.76E-01 4.68E-01 4.58E-01 4.61E-01 4.66E-01
Std Dev Un-Biased
1.16E-02 7.04E-03 7.73E-03 4.15E-03 3.36E-03 9.58E-03 1.15E-02
Ps99%/90% (+KTL) Un-Biased
5.36E-01 5.14E-01 5.12E-01 4.87E-01 4.73E-01 5.06E-01 5.20E-01
Ps99%/90% (-KTL) Un-Biased
4.28E-01 4.48E-01 4.40E-01 4.48E-01 4.42E-01 4.17E-01 4.12E-01
Specification MIN
2.00E-01 1.30E-01 1.20E-01 1.17E-01 1.10E-01 1.10E-01 1.10E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Slew Rate 1 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.43. Plot of Negative Slew Rate 1 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
93
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.43. Raw data for Negative Slew Rate 1 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Slew Rate 1 @ +/-15V (V/us)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.17E-01
-5.02E-01
-5.03E-01
-5.11E-01
-5.39E-01
-5.03E-01
-5.11E-01
-5.09E-01
-4.90E-01
-5.14E-01
-4.97E-01
-4.98E-01
Total
10
-5.15E-01
-4.91E-01
-4.95E-01
-5.13E-01
-5.20E-01
-4.98E-01
-5.10E-01
-5.09E-01
-4.89E-01
-4.99E-01
-5.01E-01
-4.98E-01
Dose (krad(Si))
20
30
-5.29E-01 -5.12E-01
-4.88E-01 -4.79E-01
-4.86E-01 -4.90E-01
-5.09E-01 -5.02E-01
-5.22E-01 -5.06E-01
-5.11E-01 -4.93E-01
-5.02E-01 -5.04E-01
-5.00E-01 -5.04E-01
-4.89E-01 -5.05E-01
-5.08E-01 -4.98E-01
-5.01E-01 -5.04E-01
-4.87E-01 -5.00E-01
50
-5.09E-01
-4.81E-01
-4.65E-01
-4.96E-01
-5.07E-01
-4.68E-01
-4.85E-01
-4.83E-01
-4.72E-01
-4.80E-01
-4.81E-01
-4.96E-01
24-hr
Anneal
60
-5.14E-01
-4.58E-01
-4.74E-01
-4.97E-01
-5.13E-01
-4.84E-01
-4.78E-01
-4.90E-01
-4.74E-01
-4.84E-01
-4.95E-01
-4.94E-01
168-hr
Anneal
70
-5.12E-01
-4.65E-01
-4.77E-01
-4.83E-01
-4.99E-01
-4.74E-01
-5.03E-01
-5.06E-01
-4.87E-01
-5.03E-01
-4.88E-01
-4.87E-01
-5.14E-01 -5.07E-01 -5.07E-01 -4.98E-01 -4.92E-01 -4.91E-01 -4.87E-01
1.51E-02 1.29E-02 1.95E-02 1.32E-02 1.86E-02 2.46E-02 1.85E-02
-4.44E-01 -4.46E-01 -4.16E-01 -4.36E-01 -4.05E-01 -3.76E-01 -4.01E-01
-5.85E-01 -5.67E-01 -5.98E-01 -5.60E-01 -5.78E-01 -6.06E-01 -5.74E-01
-5.05E-01
9.50E-03
-4.61E-01
-5.50E-01
-2.00E-01
PASS
-5.01E-01
8.69E-03
-4.60E-01
-5.42E-01
-1.30E-01
PASS
-5.02E-01
8.51E-03
-4.62E-01
-5.42E-01
-1.20E-01
PASS
-5.01E-01
5.17E-03
-4.77E-01
-5.25E-01
-1.17E-01
PASS
-4.78E-01
7.30E-03
-4.44E-01
-5.12E-01
-1.10E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
94
-4.82E-01
6.16E-03
-4.53E-01
-5.11E-01
-1.10E-01
PASS
-4.95E-01
1.37E-02
-4.31E-01
-5.59E-01
-1.10E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Slew Rate 2 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.44. Plot of Negative Slew Rate 2 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
95
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.44. Raw data for Negative Slew Rate 2 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Slew Rate 2 @ +/-15V (V/us)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.17E-01
-5.73E-01
-5.52E-01
-5.85E-01
-5.72E-01
-5.92E-01
-5.63E-01
-5.66E-01
-5.50E-01
-5.50E-01
-5.44E-01
-5.57E-01
Total
10
-5.28E-01
-5.73E-01
-5.49E-01
-5.67E-01
-5.60E-01
-5.62E-01
-5.59E-01
-5.71E-01
-5.21E-01
-5.48E-01
-5.42E-01
-5.63E-01
Dose (krad(Si))
20
30
-5.07E-01 -5.02E-01
-5.62E-01 -5.77E-01
-5.49E-01 -5.41E-01
-5.48E-01 -5.42E-01
-5.87E-01 -5.38E-01
-5.80E-01 -5.58E-01
-5.43E-01 -5.32E-01
-5.63E-01 -5.61E-01
-5.34E-01 -5.08E-01
-5.39E-01 -5.43E-01
-5.28E-01 -5.33E-01
-5.71E-01 -5.65E-01
50
-4.96E-01
-5.44E-01
-5.35E-01
-5.33E-01
-5.42E-01
-5.57E-01
-5.24E-01
-5.47E-01
-5.09E-01
-5.17E-01
-5.29E-01
-5.59E-01
24-hr
Anneal
60
-4.92E-01
-5.35E-01
-5.45E-01
-5.39E-01
-5.44E-01
-5.29E-01
-5.47E-01
-5.45E-01
-5.11E-01
-5.27E-01
-5.35E-01
-5.69E-01
168-hr
Anneal
70
-4.88E-01
-5.31E-01
-5.30E-01
-5.33E-01
-5.31E-01
-5.76E-01
-5.22E-01
-5.32E-01
-5.16E-01
-5.29E-01
-5.54E-01
-5.67E-01
-5.60E-01 -5.55E-01 -5.51E-01 -5.40E-01 -5.30E-01 -5.31E-01 -5.23E-01
2.67E-02 1.77E-02 2.90E-02 2.66E-02 1.96E-02 2.22E-02 1.94E-02
-4.35E-01 -4.73E-01 -4.15E-01 -4.16E-01 -4.39E-01 -4.28E-01 -4.32E-01
-6.84E-01 -6.38E-01 -6.86E-01 -6.64E-01 -6.21E-01 -6.34E-01 -6.13E-01
-5.64E-01
1.72E-02
-4.84E-01
-6.44E-01
-2.00E-01
PASS
-5.52E-01
1.93E-02
-4.62E-01
-6.42E-01
-1.30E-01
PASS
-5.52E-01
1.92E-02
-4.62E-01
-6.42E-01
-1.20E-01
PASS
-5.40E-01
2.16E-02
-4.40E-01
-6.41E-01
-1.17E-01
PASS
-5.31E-01
2.04E-02
-4.36E-01
-6.26E-01
-1.10E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
96
-5.32E-01
1.47E-02
-4.63E-01
-6.01E-01
-1.10E-01
PASS
-5.35E-01
2.37E-02
-4.24E-01
-6.46E-01
-1.10E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Slew Rate 3 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.45. Plot of Negative Slew Rate 3 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
97
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.45. Raw data for Negative Slew Rate 3 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Slew Rate 3 @ +/-15V (V/us)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-4.95E-01
-5.37E-01
-5.26E-01
-5.27E-01
-5.46E-01
-5.58E-01
-5.36E-01
-5.46E-01
-4.95E-01
-5.04E-01
-5.06E-01
-5.26E-01
Total
10
-4.89E-01
-5.35E-01
-5.15E-01
-5.27E-01
-5.14E-01
-5.44E-01
-5.27E-01
-5.26E-01
-4.96E-01
-5.22E-01
-5.06E-01
-5.38E-01
Dose (krad(Si))
20
30
-4.90E-01 -4.88E-01
-5.43E-01 -5.22E-01
-5.19E-01 -5.17E-01
-5.32E-01 -5.16E-01
-5.28E-01 -5.22E-01
-5.39E-01 -5.28E-01
-5.12E-01 -5.04E-01
-5.30E-01 -5.20E-01
-4.91E-01 -4.96E-01
-5.24E-01 -5.07E-01
-5.13E-01 -5.16E-01
-5.42E-01 -5.35E-01
50
-4.64E-01
-5.10E-01
-5.08E-01
-5.05E-01
-5.17E-01
-5.17E-01
-4.92E-01
-5.14E-01
-4.95E-01
-4.94E-01
-5.02E-01
-5.37E-01
24-hr
Anneal
60
-4.58E-01
-5.14E-01
-4.90E-01
-4.99E-01
-5.10E-01
-5.18E-01
-5.00E-01
-5.18E-01
-4.87E-01
-4.90E-01
-5.10E-01
-5.33E-01
168-hr
Anneal
70
-4.58E-01
-5.10E-01
-5.09E-01
-5.08E-01
-5.07E-01
-5.26E-01
-5.00E-01
-5.22E-01
-4.98E-01
-4.91E-01
-5.19E-01
-5.33E-01
-5.26E-01 -5.16E-01 -5.22E-01 -5.13E-01 -5.01E-01 -4.94E-01 -4.98E-01
1.93E-02 1.74E-02 2.01E-02 1.42E-02 2.10E-02 2.23E-02 2.26E-02
-4.36E-01 -4.35E-01 -4.29E-01 -4.47E-01 -4.03E-01 -3.90E-01 -3.93E-01
-6.16E-01 -5.97E-01 -6.16E-01 -5.79E-01 -5.99E-01 -5.98E-01 -6.04E-01
-5.28E-01
2.72E-02
-4.01E-01
-6.55E-01
-2.00E-01
PASS
-5.23E-01
1.73E-02
-4.42E-01
-6.04E-01
-1.30E-01
PASS
-5.19E-01
1.86E-02
-4.33E-01
-6.06E-01
-1.20E-01
PASS
-5.11E-01
1.28E-02
-4.51E-01
-5.71E-01
-1.17E-01
PASS
-5.02E-01
1.21E-02
-4.46E-01
-5.59E-01
-1.10E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
98
-5.03E-01
1.49E-02
-4.33E-01
-5.72E-01
-1.10E-01
PASS
-5.07E-01
1.56E-02
-4.35E-01
-5.80E-01
-1.10E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Negative Slew Rate 4 @ +/-15V (V/us)
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
-5.00E-01
-6.00E-01
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.46. Plot of Negative Slew Rate 4 @ +/-15V (V/us) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
99
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.46. Raw data for Negative Slew Rate 4 @ +/-15V (V/us) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Negative Slew Rate 4 @ +/-15V (V/us)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.68E-01
-5.33E-01
-5.42E-01
-5.45E-01
-5.55E-01
-5.43E-01
-5.58E-01
-5.46E-01
-5.29E-01
-5.23E-01
-5.33E-01
-5.28E-01
Total
10
-5.40E-01
-5.15E-01
-5.42E-01
-5.37E-01
-5.49E-01
-5.48E-01
-5.47E-01
-5.59E-01
-5.39E-01
-5.29E-01
-5.24E-01
-5.27E-01
Dose (krad(Si))
20
30
-5.34E-01 -5.50E-01
-5.20E-01 -5.15E-01
-5.36E-01 -5.09E-01
-5.34E-01 -5.30E-01
-5.52E-01 -5.42E-01
-5.21E-01 -5.37E-01
-5.45E-01 -5.36E-01
-5.49E-01 -5.37E-01
-5.09E-01 -5.14E-01
-5.35E-01 -5.41E-01
-5.35E-01 -5.23E-01
-5.18E-01 -5.33E-01
50
-5.27E-01
-4.93E-01
-5.09E-01
-5.08E-01
-5.52E-01
-5.17E-01
-5.12E-01
-5.14E-01
-4.99E-01
-5.14E-01
-5.36E-01
-5.31E-01
24-hr
Anneal
60
-5.28E-01
-5.03E-01
-4.93E-01
-5.11E-01
-5.25E-01
-5.02E-01
-5.31E-01
-5.23E-01
-5.04E-01
-5.05E-01
-5.18E-01
-5.32E-01
168-hr
Anneal
70
-5.43E-01
-4.88E-01
-5.09E-01
-5.05E-01
-5.43E-01
-5.28E-01
-5.24E-01
-5.19E-01
-4.98E-01
-5.13E-01
-5.24E-01
-5.35E-01
-5.49E-01 -5.37E-01 -5.35E-01 -5.29E-01 -5.18E-01 -5.12E-01 -5.18E-01
1.34E-02 1.29E-02 1.14E-02 1.74E-02 2.26E-02 1.47E-02 2.45E-02
-4.86E-01 -4.77E-01 -4.82E-01 -4.48E-01 -4.12E-01 -4.43E-01 -4.03E-01
-6.11E-01 -5.97E-01 -5.88E-01 -6.10E-01 -6.23E-01 -5.81E-01 -6.32E-01
-5.40E-01
1.40E-02
-4.75E-01
-6.05E-01
-2.00E-01
PASS
-5.44E-01
1.12E-02
-4.92E-01
-5.97E-01
-1.30E-01
PASS
-5.32E-01
1.67E-02
-4.54E-01
-6.10E-01
-1.20E-01
PASS
-5.33E-01
1.08E-02
-4.83E-01
-5.83E-01
-1.17E-01
PASS
-5.11E-01
7.05E-03
-4.78E-01
-5.44E-01
-1.10E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
100
-5.13E-01
1.31E-02
-4.52E-01
-5.74E-01
-1.10E-01
PASS
-5.16E-01
1.17E-02
-4.62E-01
-5.71E-01
-1.10E-01
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Positive Supply Current @ +5V (A)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.47. Plot of Positive Supply Current @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
101
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.47. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Supply Current @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.32E-03 1.35E-03 1.33E-03 1.30E-03 1.22E-03 1.22E-03 1.19E-03
1115 1.38E-03 1.36E-03 1.37E-03 1.34E-03 1.26E-03 1.26E-03 1.23E-03
1116 1.33E-03 1.32E-03 1.32E-03 1.29E-03 1.21E-03 1.21E-03 1.17E-03
1117 1.35E-03 1.35E-03 1.35E-03 1.32E-03 1.24E-03 1.23E-03 1.21E-03
1118 1.38E-03 1.37E-03 1.37E-03 1.35E-03 1.26E-03 1.26E-03 1.23E-03
1119 1.36E-03 1.41E-03 1.38E-03 1.36E-03 1.29E-03 1.29E-03 1.29E-03
1120 1.37E-03 1.43E-03 1.40E-03 1.38E-03 1.32E-03 1.32E-03 1.31E-03
1121 1.36E-03 1.43E-03 1.40E-03 1.38E-03 1.32E-03 1.32E-03 1.31E-03
1122 1.33E-03 1.40E-03 1.38E-03 1.36E-03 1.30E-03 1.30E-03 1.29E-03
1123 1.34E-03 1.41E-03 1.39E-03 1.38E-03 1.31E-03 1.31E-03 1.30E-03
1124 1.32E-03 1.32E-03 1.32E-03 1.32E-03 1.32E-03 1.32E-03 1.32E-03
1125 1.34E-03 1.34E-03 1.34E-03 1.34E-03 1.33E-03 1.33E-03 1.34E-03
Biased Statistics
Average Biased
1.35E-03 1.35E-03 1.35E-03 1.32E-03 1.24E-03 1.24E-03 1.20E-03
Std Dev Biased
2.89E-05 1.87E-05 2.22E-05 2.38E-05 2.45E-05 2.34E-05 2.61E-05
Ps99%/90% (+KTL) Biased
1.49E-03 1.44E-03 1.45E-03 1.43E-03 1.35E-03 1.35E-03 1.33E-03
Ps99%/90% (-KTL) Biased
1.22E-03 1.26E-03 1.24E-03 1.21E-03 1.12E-03 1.13E-03 1.08E-03
Un-Biased Statistics
Average Un-Biased
1.35E-03 1.42E-03 1.39E-03 1.37E-03 1.31E-03 1.31E-03 1.30E-03
Std Dev Un-Biased
1.81E-05 1.18E-05 1.10E-05 1.08E-05 1.27E-05 1.23E-05 1.29E-05
Ps99%/90% (+KTL) Un-Biased
1.44E-03 1.47E-03 1.44E-03 1.42E-03 1.37E-03 1.37E-03 1.36E-03
Ps99%/90% (-KTL) Un-Biased
1.27E-03 1.36E-03 1.34E-03 1.32E-03 1.25E-03 1.25E-03 1.24E-03
Specification MAX
2.00E-03 2.00E-03 2.00E-03 2.00E-03 2.00E-03 2.00E-03 2.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
Negative Supply Current @ +5V (A)
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
-2.00E-03
-2.50E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.48. Plot of Negative Supply Current @ +5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
103
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.48. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Negative Supply Current @ +5V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.30E-03
-1.36E-03
-1.30E-03
-1.32E-03
-1.35E-03
-1.33E-03
-1.35E-03
-1.34E-03
-1.31E-03
-1.32E-03
-1.30E-03
-1.32E-03
Total
10
-1.33E-03
-1.34E-03
-1.31E-03
-1.33E-03
-1.35E-03
-1.39E-03
-1.41E-03
-1.41E-03
-1.39E-03
-1.39E-03
-1.30E-03
-1.32E-03
Dose (krad(Si))
20
30
-1.31E-03 -1.28E-03
-1.35E-03 -1.32E-03
-1.30E-03 -1.27E-03
-1.33E-03 -1.30E-03
-1.35E-03 -1.32E-03
-1.36E-03 -1.34E-03
-1.38E-03 -1.36E-03
-1.38E-03 -1.37E-03
-1.36E-03 -1.34E-03
-1.36E-03 -1.35E-03
-1.30E-03 -1.30E-03
-1.32E-03 -1.32E-03
50
-1.19E-03
-1.24E-03
-1.19E-03
-1.21E-03
-1.24E-03
-1.27E-03
-1.30E-03
-1.30E-03
-1.27E-03
-1.28E-03
-1.30E-03
-1.32E-03
24-hr
Anneal
60
-1.20E-03
-1.24E-03
-1.19E-03
-1.22E-03
-1.23E-03
-1.27E-03
-1.30E-03
-1.30E-03
-1.28E-03
-1.28E-03
-1.30E-03
-1.32E-03
168-hr
Anneal
70
-1.17E-03
-1.21E-03
-1.15E-03
-1.19E-03
-1.20E-03
-1.27E-03
-1.29E-03
-1.29E-03
-1.27E-03
-1.28E-03
-1.30E-03
-1.32E-03
-1.33E-03 -1.33E-03 -1.33E-03 -1.30E-03 -1.21E-03 -1.22E-03 -1.18E-03
2.84E-05 1.54E-05 2.28E-05 2.15E-05 2.38E-05 2.28E-05 2.60E-05
-1.20E-03 -1.26E-03 -1.22E-03 -1.20E-03 -1.10E-03 -1.11E-03 -1.06E-03
-1.46E-03 -1.40E-03 -1.43E-03 -1.40E-03 -1.32E-03 -1.32E-03 -1.30E-03
-1.33E-03
1.69E-05
-1.25E-03
-1.41E-03
-2.00E-03
PASS
-1.40E-03
9.40E-06
-1.35E-03
-1.44E-03
-2.00E-03
PASS
-1.37E-03
1.11E-05
-1.32E-03
-1.42E-03
-2.00E-03
PASS
-1.35E-03
1.41E-05
-1.28E-03
-1.42E-03
-2.00E-03
PASS
-1.28E-03
1.39E-05
-1.22E-03
-1.35E-03
-2.00E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
104
-1.29E-03
1.41E-05
-1.22E-03
-1.35E-03
-2.00E-03
PASS
-1.28E-03
1.21E-05
-1.22E-03
-1.34E-03
-2.00E-03
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
Offset Voltage 1 @ +5V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.49. Plot of Offset Voltage 1 @ +5V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
105
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.49. Raw data for Offset Voltage 1 @ +5V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 1 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.02E-04
-6.14E-05
-3.48E-05
1.52E-05
6.76E-05
3.96E-05
-2.33E-05
-5.84E-05
-7.40E-05
4.46E-06
-1.06E-04
-3.88E-05
Total
10
9.98E-05
-5.83E-05
-2.99E-05
1.91E-05
6.98E-05
5.43E-05
-4.95E-06
-4.51E-05
-6.33E-05
1.69E-05
-1.06E-04
-3.90E-05
Dose (krad(Si))
20
30
1.09E-04 1.17E-04
-4.67E-05 -4.07E-05
-1.75E-05 -4.23E-06
2.88E-05 3.86E-05
7.82E-05 9.16E-05
6.47E-05 7.02E-05
1.09E-05 2.14E-05
-3.87E-05 -3.25E-05
-5.00E-05 -4.56E-05
2.55E-05 2.99E-05
-1.06E-04 -1.08E-04
-3.98E-05 -4.09E-05
50
1.42E-04
-1.87E-05
2.53E-05
6.61E-05
1.19E-04
9.09E-05
5.44E-05
-1.05E-05
-2.08E-05
5.61E-05
-1.06E-04
-4.07E-05
24-hr
Anneal
60
1.42E-04
-2.04E-05
2.43E-05
6.60E-05
1.19E-04
9.08E-05
5.04E-05
-1.22E-05
-2.20E-05
5.65E-05
-1.06E-04
-4.12E-05
168-hr
Anneal
70
1.37E-04
-4.04E-05
1.50E-05
4.76E-05
9.21E-05
5.96E-05
1.92E-06
-3.45E-05
-5.09E-05
1.95E-05
-1.06E-04
-4.04E-05
1.77E-05 2.01E-05 3.04E-05 4.04E-05 6.68E-05 6.62E-05 5.02E-05
6.83E-05 6.61E-05 6.47E-05 6.52E-05 6.60E-05 6.67E-05 6.84E-05
3.36E-04 3.28E-04 3.32E-04 3.45E-04 3.75E-04 3.78E-04 3.69E-04
-3.01E-04 -2.88E-04 -2.71E-04 -2.64E-04 -2.41E-04 -2.45E-04 -2.69E-04
-2.23E-05
4.62E-05
1.93E-04
-2.38E-04
-4.50E-04
PASS
4.50E-04
PASS
-8.43E-06
4.73E-05
2.12E-04
-2.29E-04
-6.00E-04
PASS
6.00E-04
PASS
2.46E-06
4.72E-05
2.23E-04
-2.18E-04
-6.00E-04
PASS
6.00E-04
PASS
8.69E-06
4.76E-05
2.31E-04
-2.13E-04
-6.50E-04
PASS
6.50E-04
PASS
3.40E-05
4.78E-05
2.57E-04
-1.89E-04
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
106
3.27E-05
4.81E-05
2.57E-04
-1.92E-04
-7.50E-04
PASS
7.50E-04
PASS
-8.77E-07
4.39E-05
2.04E-04
-2.06E-04
-7.50E-04
PASS
7.50E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
Offset Voltage 2 @ +5V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.50. Plot of Offset Voltage 2 @ +5V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
107
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.50. Raw data for Offset Voltage 2 @ +5V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 2 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.13E-04
-7.24E-05
-6.10E-05
-1.29E-05
-2.02E-05
-3.90E-05
-7.97E-06
-3.04E-05
-5.79E-05
-1.84E-05
-1.64E-05
-3.88E-05
Total
10
-1.01E-04
-5.50E-05
-4.47E-05
5.91E-06
-6.88E-06
-3.09E-05
-8.49E-07
-1.74E-05
-4.80E-05
-7.37E-06
-1.58E-05
-3.77E-05
Dose (krad(Si))
20
30
-8.57E-05 -7.13E-05
-4.90E-05 -4.33E-05
-3.60E-05 -2.74E-05
1.52E-05 2.22E-05
9.63E-07 9.65E-06
-2.34E-05 -1.64E-05
4.46E-06 5.79E-06
-1.05E-05 -6.04E-06
-4.00E-05 -3.60E-05
-8.47E-07 3.50E-06
-1.51E-05 -1.58E-05
-3.80E-05 -3.77E-05
50
-4.65E-05
-2.61E-05
-1.11E-05
3.52E-05
2.79E-05
-1.33E-06
1.71E-05
5.91E-06
-1.92E-05
1.65E-05
-1.63E-05
-3.77E-05
24-hr
Anneal
60
-4.83E-05
-2.72E-05
-1.12E-05
3.32E-05
2.64E-05
-7.31E-07
1.86E-05
6.03E-06
-1.96E-05
1.68E-05
-1.65E-05
-3.83E-05
168-hr
Anneal
70
-7.12E-05
-4.44E-05
-3.10E-05
1.74E-05
6.27E-06
-2.55E-05
-4.84E-06
-1.94E-05
-5.24E-05
-6.29E-06
-1.63E-05
-3.76E-05
-5.58E-05 -4.03E-05 -3.09E-05 -2.20E-05 -4.11E-06 -5.41E-06 -2.46E-05
4.07E-05 4.23E-05 4.03E-05 3.83E-05 3.50E-05 3.48E-05 3.65E-05
1.34E-04 1.57E-04 1.57E-04 1.57E-04 1.59E-04 1.57E-04 1.46E-04
-2.46E-04 -2.38E-04 -2.19E-04 -2.01E-04 -1.67E-04 -1.68E-04 -1.95E-04
-3.07E-05
1.92E-05
5.90E-05
-1.20E-04
-4.50E-04
PASS
4.50E-04
PASS
-2.09E-05
1.89E-05
6.74E-05
-1.09E-04
-6.00E-04
PASS
6.00E-04
PASS
-1.41E-05
1.79E-05
6.97E-05
-9.78E-05
-6.00E-04
PASS
6.00E-04
PASS
-9.83E-06
1.70E-05
6.97E-05
-8.94E-05
-6.50E-04
PASS
6.50E-04
PASS
3.81E-06
1.50E-05
7.38E-05
-6.62E-05
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
108
4.22E-06
1.55E-05
7.64E-05
-6.80E-05
-7.50E-04
PASS
7.50E-04
PASS
-2.17E-05
1.93E-05
6.82E-05
-1.12E-04
-7.50E-04
PASS
7.50E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
Offset Voltage 3 @ +5V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.51. Plot of Offset Voltage 3 @ +5V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
109
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.51. Raw data for Offset Voltage 3 @ +5V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 3 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-9.22E-05
-6.35E-05
-5.96E-05
-8.16E-05
-1.16E-04
-9.70E-07
-3.57E-05
-1.84E-05
-2.76E-05
-3.11E-05
-1.11E-04
-7.70E-05
Total
10
-9.70E-05
-5.61E-05
-5.64E-05
-8.09E-05
-1.12E-04
1.23E-05
-2.28E-05
-1.82E-06
-1.21E-05
-1.81E-05
-1.10E-04
-7.65E-05
Dose (krad(Si))
20
30
-8.22E-05 -6.95E-05
-5.00E-05 -4.48E-05
-4.91E-05 -4.32E-05
-7.09E-05 -6.04E-05
-1.05E-04 -9.66E-05
2.08E-05 2.61E-05
-1.63E-05 -1.05E-05
9.53E-06 1.81E-05
-3.87E-06 2.38E-07
-1.15E-05 -4.47E-06
-1.11E-04 -1.12E-04
-7.75E-05 -7.80E-05
50
-4.53E-05
-3.54E-05
-2.34E-05
-3.86E-05
-8.23E-05
3.26E-05
6.76E-06
3.97E-05
1.54E-05
1.46E-05
-1.11E-04
-7.79E-05
24-hr
Anneal
60
-4.66E-05
-3.77E-05
-2.40E-05
-3.90E-05
-8.24E-05
3.31E-05
5.91E-06
3.93E-05
1.59E-05
1.47E-05
-1.12E-04
-7.81E-05
168-hr
Anneal
70
-5.17E-05
-4.99E-05
-3.76E-05
-4.60E-05
-9.38E-05
1.27E-05
-1.45E-05
8.20E-06
-1.08E-05
-6.17E-06
-1.11E-04
-7.81E-05
-8.26E-05 -8.04E-05 -7.14E-05 -6.29E-05 -4.50E-05 -4.59E-05 -5.58E-05
2.30E-05 2.46E-05 2.33E-05 2.18E-05 2.23E-05 2.20E-05 2.19E-05
2.47E-05 3.45E-05 3.75E-05 3.88E-05 5.91E-05 5.65E-05 4.66E-05
-1.90E-04 -1.95E-04 -1.80E-04 -1.65E-04 -1.49E-04 -1.48E-04 -1.58E-04
-2.28E-05
1.38E-05
4.14E-05
-8.70E-05
-4.50E-04
PASS
4.50E-04
PASS
-8.50E-06
1.40E-05
5.70E-05
-7.40E-05
-6.00E-04
PASS
6.00E-04
PASS
-2.68E-07
1.53E-05
7.10E-05
-7.15E-05
-6.00E-04
PASS
6.00E-04
PASS
5.89E-06
1.55E-05
7.83E-05
-6.66E-05
-6.50E-04
PASS
6.50E-04
PASS
2.18E-05
1.37E-05
8.59E-05
-4.23E-05
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
110
2.18E-05
1.39E-05
8.66E-05
-4.30E-05
-7.50E-04
PASS
7.50E-04
PASS
-2.11E-06
1.19E-05
5.35E-05
-5.78E-05
-7.50E-04
PASS
7.50E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-03
Offset Voltage 4 @ +5V (V)
8.00E-04
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
-8.00E-04
-1.00E-03
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.52. Plot of Offset Voltage 4 @ +5V (V) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
111
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.52. Raw data for Offset Voltage 4 @ +5V (V) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Voltage 4 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-5.87E-05
-9.15E-05
6.39E-06
7.24E-06
2.31E-05
-3.10E-05
-4.39E-05
-4.10E-05
-1.96E-05
-8.68E-05
-5.73E-05
1.87E-05
Total
10
-4.70E-05
-8.17E-05
2.16E-05
2.29E-05
6.29E-05
-1.49E-05
-2.29E-05
-2.62E-05
-4.59E-06
-7.30E-05
-5.55E-05
1.94E-05
Dose (krad(Si))
20
30
-4.37E-05 -3.84E-05
-6.70E-05 -5.95E-05
3.33E-05 3.97E-05
3.71E-05 4.45E-05
7.47E-05 8.07E-05
-4.23E-06 5.07E-06
-5.68E-06 7.96E-06
-1.45E-05 -3.99E-06
9.17E-06 1.80E-05
-6.46E-05 -5.90E-05
-5.59E-05 -5.62E-05
1.87E-05 1.76E-05
50
-3.08E-05
-4.18E-05
5.25E-05
6.95E-05
1.01E-04
2.50E-05
3.75E-05
2.30E-05
4.48E-05
-3.68E-05
-5.64E-05
1.99E-05
24-hr
Anneal
60
-3.08E-05
-4.35E-05
5.15E-05
6.83E-05
1.01E-04
2.61E-05
3.78E-05
2.09E-05
4.34E-05
-3.85E-05
-5.60E-05
1.97E-05
168-hr
Anneal
70
-4.29E-05
-5.75E-05
3.75E-05
5.20E-05
6.98E-05
-8.10E-06
-1.26E-05
-2.03E-05
6.27E-06
-6.99E-05
-5.59E-05
1.92E-05
-2.27E-05 -4.25E-06 6.88E-06 1.34E-05 3.01E-05 2.93E-05 1.18E-05
4.97E-05 5.86E-05 5.96E-05 5.96E-05 6.32E-05 6.34E-05 5.79E-05
2.09E-04 2.69E-04 2.85E-04 2.91E-04 3.25E-04 3.25E-04 2.82E-04
-2.54E-04 -2.78E-04 -2.71E-04 -2.65E-04 -2.65E-04 -2.66E-04 -2.59E-04
-4.45E-05
2.55E-05
7.46E-05
-1.64E-04
-4.50E-04
PASS
4.50E-04
PASS
-2.83E-05
2.63E-05
9.46E-05
-1.51E-04
-6.00E-04
PASS
6.00E-04
PASS
-1.60E-05
2.85E-05
1.17E-04
-1.49E-04
-6.00E-04
PASS
6.00E-04
PASS
-6.40E-06
3.04E-05
1.36E-04
-1.48E-04
-6.50E-04
PASS
6.50E-04
PASS
1.87E-05
3.23E-05
1.69E-04
-1.32E-04
-7.50E-04
PASS
7.50E-04
PASS
An ISO 9001:2008 and DSCC Certified Company
112
1.79E-05
3.28E-05
1.71E-04
-1.35E-04
-7.50E-04
PASS
7.50E-04
PASS
-2.09E-05
2.90E-05
1.15E-04
-1.56E-04
-7.50E-04
PASS
7.50E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 1 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.53. Plot of Offset Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
113
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.53. Raw data for Offset Current 1 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 1 @ +5V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
3.60E-11
-4.90E-11
-9.00E-12
-6.10E-11
3.60E-11
1.60E-11
-1.27E-10
4.80E-11
-2.00E-11
-1.00E-11
-4.50E-11
6.30E-11
Total
10
7.50E-11
-1.20E-11
-1.20E-11
-2.20E-11
-2.90E-11
4.20E-11
-7.10E-11
1.80E-11
-3.30E-11
4.00E-12
-7.70E-11
6.80E-11
Dose (krad(Si))
20
30
1.90E-11 -2.60E-11
3.60E-11 1.58E-10
5.00E-12 -1.02E-10
8.80E-11 1.09E-10
-6.90E-11 -2.50E-11
7.00E-11 6.20E-11
-2.40E-11 8.00E-11
2.10E-11 4.10E-11
-1.22E-10 -9.40E-11
1.30E-11 -2.00E-11
-8.40E-11 -8.20E-11
5.10E-11 4.90E-11
50
-1.30E-10
1.99E-10
1.02E-10
1.02E-10
-6.80E-11
2.93E-10
1.87E-10
3.30E-11
-3.80E-11
-6.50E-11
-7.50E-11
4.60E-11
24-hr
168-hr
Anneal
Anneal
60
70
-1.08E-10 -2.00E-11
1.85E-10 1.65E-10
7.10E-11 2.00E-12
6.60E-11 5.30E-11
2.40E-11 1.28E-10
2.80E-10 1.38E-10
3.08E-10 9.30E-11
5.90E-11 1.97E-10
4.50E-11 7.50E-11
-5.90E-11 -6.50E-11
-6.60E-11 -7.40E-11
3.50E-11 4.20E-11
-9.40E-12 6.46E-28 1.58E-11 2.28E-11 4.10E-11 4.76E-11 6.56E-11
4.57E-11 4.25E-11 5.69E-11 1.07E-10 1.36E-10 1.06E-10 7.95E-11
2.04E-10 1.98E-10 2.81E-10 5.23E-10 6.74E-10 5.40E-10 4.37E-10
-2.23E-10 -1.98E-10 -2.50E-10 -4.77E-10 -5.92E-10 -4.45E-10 -3.06E-10
-1.86E-11
6.61E-11
2.90E-10
-3.27E-10
-1.00E-08
PASS
1.00E-08
PASS
-8.00E-12
4.45E-11
2.00E-10
-2.16E-10
-1.00E-08
PASS
1.00E-08
PASS
-8.40E-12
7.18E-11
3.27E-10
-3.43E-10
-1.00E-08
PASS
1.00E-08
PASS
1.38E-11
7.11E-11
3.45E-10
-3.18E-10
-1.17E-08
PASS
1.17E-08
PASS
8.20E-11
1.53E-10
7.97E-10
-6.33E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
114
1.27E-10
1.60E-10
8.72E-10
-6.19E-10
-1.50E-08
PASS
1.50E-08
PASS
8.76E-11
9.74E-11
5.42E-10
-3.67E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 2 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.54. Plot of Offset Current 2 @ +5V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
115
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.54. Raw data for Offset Current 2 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 2 @ +5V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-7.30E-11
5.50E-11
1.40E-11
-6.50E-11
4.70E-11
-1.76E-10
3.70E-11
1.50E-11
-1.83E-10
1.10E-11
-3.70E-11
9.70E-11
Total
10
-5.10E-11
0.00E+00
-4.20E-11
-1.18E-10
1.18E-10
-1.16E-10
9.50E-11
7.90E-11
-4.60E-11
2.00E-11
-2.10E-11
8.60E-11
Dose (krad(Si))
20
30
-3.50E-11 -8.40E-11
7.50E-11 7.60E-11
-1.35E-10 -1.68E-10
-1.91E-10 -8.30E-11
4.50E-11 2.90E-11
-2.60E-11 3.10E-11
6.00E-12 7.10E-11
7.20E-11 1.39E-10
2.90E-11 4.80E-11
-2.40E-11 -7.00E-12
-3.80E-11 -3.80E-11
8.80E-11 9.90E-11
50
2.10E-11
1.37E-10
-1.57E-10
-9.90E-11
1.76E-10
1.24E-10
1.40E-11
4.20E-11
1.43E-10
-2.00E-12
-3.30E-11
8.60E-11
24-hr
Anneal
60
5.40E-11
8.90E-11
-1.63E-10
-4.00E-11
1.57E-10
1.30E-10
1.06E-10
7.10E-11
1.73E-10
-9.40E-11
-1.50E-11
1.19E-10
168-hr
Anneal
70
-3.70E-11
-2.40E-11
-1.15E-10
-1.36E-10
2.10E-10
1.33E-10
1.41E-10
5.90E-11
1.59E-10
-2.40E-11
-4.00E-11
1.07E-10
-4.40E-12 -1.86E-11 -4.82E-11 -4.60E-11 1.56E-11 1.94E-11 -2.04E-11
6.10E-11 8.73E-11 1.14E-10 9.77E-11 1.44E-10 1.24E-10 1.38E-10
2.80E-10 3.89E-10 4.84E-10 4.10E-10 6.89E-10 5.99E-10 6.21E-10
-2.89E-10 -4.26E-10 -5.80E-10 -5.02E-10 -6.58E-10 -5.60E-10 -6.62E-10
-5.92E-11
1.10E-10
4.55E-10
-5.74E-10
-1.00E-08
PASS
1.00E-08
PASS
6.40E-12
8.81E-11
4.17E-10
-4.05E-10
-1.00E-08
PASS
1.00E-08
PASS
1.14E-11
4.08E-11
2.02E-10
-1.79E-10
-1.00E-08
PASS
1.00E-08
PASS
5.64E-11
5.42E-11
3.10E-10
-1.97E-10
-1.17E-08
PASS
1.17E-08
PASS
6.42E-11
6.55E-11
3.70E-10
-2.42E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
116
7.72E-11
1.03E-10
5.56E-10
-4.02E-10
-1.50E-08
PASS
1.50E-08
PASS
9.36E-11
7.60E-11
4.48E-10
-2.61E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 3 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.55. Plot of Offset Current 3 @ +5V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
117
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.55. Raw data for Offset Current 3 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 3 @ +5V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-2.06E-10
2.40E-11
-4.90E-11
-1.09E-10
4.00E-11
-7.30E-11
-2.10E-11
-7.40E-11
4.10E-11
-4.60E-11
1.50E-11
3.60E-11
Total
10
-1.84E-10
-2.00E-12
1.40E-11
-8.70E-11
6.10E-11
-6.20E-11
-1.16E-10
-7.50E-11
7.40E-11
-7.00E-12
4.80E-11
5.50E-11
Dose (krad(Si))
20
30
-1.43E-10 -8.60E-11
2.70E-11 4.70E-11
-7.70E-11 -9.70E-11
-2.70E-11 -3.50E-11
6.90E-11 4.00E-12
2.20E-11 8.40E-11
-1.64E-10 -1.41E-10
-1.16E-10 -1.71E-10
9.70E-11 1.45E-10
-5.00E-12 1.80E-11
2.10E-11 2.50E-11
5.30E-11 4.90E-11
50
1.40E-10
1.34E-10
-6.10E-11
-4.60E-11
-2.80E-11
2.00E-10
-1.45E-10
-1.08E-10
3.06E-10
1.33E-10
4.10E-11
3.50E-11
24-hr
Anneal
60
1.56E-10
1.48E-10
-9.50E-11
-4.00E-12
-9.30E-11
1.99E-10
-8.10E-11
-6.20E-11
2.60E-10
1.02E-10
2.80E-11
6.60E-11
168-hr
Anneal
70
-4.10E-11
1.59E-10
-1.20E-10
-5.00E-11
1.50E-10
5.00E-11
-8.30E-11
-1.04E-10
1.52E-10
8.20E-11
3.80E-11
5.40E-11
-6.00E-11 -3.96E-11 -3.02E-11 -3.34E-11 2.78E-11 2.24E-11 1.96E-11
1.01E-10 9.68E-11 8.37E-11 6.06E-11 1.00E-10 1.24E-10 1.27E-10
4.12E-10 4.12E-10 3.60E-10 2.49E-10 4.96E-10 6.01E-10 6.12E-10
-5.32E-10 -4.91E-10 -4.21E-10 -3.16E-10 -4.41E-10 -5.56E-10 -5.73E-10
-3.46E-11
4.76E-11
1.87E-10
-2.57E-10
-1.00E-08
PASS
1.00E-08
PASS
-3.72E-11
7.34E-11
3.05E-10
-3.80E-10
-1.00E-08
PASS
1.00E-08
PASS
-3.32E-11
1.06E-10
4.60E-10
-5.27E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.30E-11
1.38E-10
6.33E-10
-6.59E-10
-1.17E-08
PASS
1.17E-08
PASS
7.72E-11
1.96E-10
9.93E-10
-8.39E-10
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
118
8.36E-11
1.53E-10
7.95E-10
-6.28E-10
-1.50E-08
PASS
1.50E-08
PASS
1.94E-11
1.10E-10
5.31E-10
-4.93E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.00E-08
Offset Current 4 @ +5V (A)
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.56. Plot of Offset Current 4 @ +5V (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of
the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
119
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.56. Raw data for Offset Current 4 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
Offset Current 4 @ +5V (A)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
6.00E-12
-9.00E-11
-1.27E-10
-9.40E-11
3.20E-11
-3.70E-11
-5.70E-11
-8.00E-11
-8.30E-11
-5.40E-11
6.80E-11
1.20E-11
Total
10
-8.00E-12
-2.60E-11
-6.40E-11
-2.20E-11
-5.20E-11
-3.30E-11
9.70E-11
-1.13E-10
-1.85E-10
-1.29E-10
7.30E-11
-1.30E-11
Dose (krad(Si))
20
30
1.45E-10 1.74E-10
1.30E-11 8.70E-11
-1.90E-11 1.70E-11
-2.30E-11 -4.00E-11
-1.42E-10 -1.00E-10
-6.30E-11 3.40E-11
-2.70E-11 4.70E-11
-1.32E-10 -1.67E-10
-2.46E-10 -1.85E-10
-1.22E-10 -1.54E-10
3.80E-11 3.50E-11
3.00E-12 5.00E-12
50
3.22E-10
3.03E-10
2.14E-10
6.00E-12
-7.10E-11
7.40E-11
1.83E-10
-2.83E-10
-4.69E-10
-2.73E-10
4.10E-11
0.00E+00
24-hr
Anneal
60
2.83E-10
2.92E-10
2.40E-10
1.40E-11
-7.10E-11
6.50E-11
1.71E-10
-2.94E-10
-4.27E-10
-2.03E-10
7.70E-11
7.00E-12
168-hr
Anneal
70
2.21E-10
8.30E-11
2.39E-10
8.10E-11
-9.70E-11
8.40E-11
2.08E-10
-4.90E-11
-1.44E-10
-1.08E-10
2.90E-11
-1.20E-11
-5.46E-11 -3.44E-11 -5.20E-12 2.76E-11 1.55E-10 1.52E-10 1.05E-10
6.93E-11 2.30E-11 1.03E-10 1.07E-10 1.78E-10 1.68E-10 1.35E-10
2.69E-10 7.27E-11 4.74E-10 5.28E-10 9.85E-10 9.37E-10 7.37E-10
-3.78E-10 -1.41E-10 -4.84E-10 -4.72E-10 -6.75E-10 -6.34E-10 -5.26E-10
-6.22E-11
1.92E-11
2.75E-11
-1.52E-10
-1.00E-08
PASS
1.00E-08
PASS
-7.26E-11
1.09E-10
4.37E-10
-5.83E-10
-1.00E-08
PASS
1.00E-08
PASS
-1.18E-10
8.35E-11
2.72E-10
-5.08E-10
-1.00E-08
PASS
1.00E-08
PASS
-8.50E-11
1.15E-10
4.52E-10
-6.22E-10
-1.17E-08
PASS
1.17E-08
PASS
-1.54E-10
2.72E-10
1.11E-09
-1.42E-09
-1.50E-08
PASS
1.50E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
120
-1.38E-10
2.49E-10
1.03E-09
-1.30E-09
-1.50E-08
PASS
1.50E-08
PASS
-1.80E-12
1.46E-10
6.79E-10
-6.82E-10
-1.50E-08
PASS
1.50E-08
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 1 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.57. Plot of Positive Bias Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
121
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.57. Raw data for Positive Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 1 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.16E-08 1.42E-08 1.76E-08 2.04E-08 2.76E-08 2.77E-08 2.59E-08
1115 1.21E-08 1.45E-08 1.80E-08 2.08E-08 2.80E-08 2.82E-08 2.64E-08
1116 1.15E-08 1.41E-08 1.75E-08 2.04E-08 2.75E-08 2.78E-08 2.61E-08
1117 1.17E-08 1.42E-08 1.76E-08 2.03E-08 2.75E-08 2.77E-08 2.61E-08
1118 1.21E-08 1.46E-08 1.82E-08 2.09E-08 2.85E-08 2.85E-08 2.68E-08
1119 1.14E-08 1.35E-08 1.57E-08 1.75E-08 2.18E-08 2.17E-08 1.98E-08
1120 1.18E-08 1.38E-08 1.61E-08 1.78E-08 2.23E-08 2.21E-08 2.03E-08
1121 1.09E-08 1.27E-08 1.49E-08 1.65E-08 2.08E-08 2.06E-08 1.87E-08
1122 1.19E-08 1.40E-08 1.64E-08 1.81E-08 2.26E-08 2.24E-08 2.04E-08
1123 1.11E-08 1.31E-08 1.53E-08 1.70E-08 2.12E-08 2.11E-08 1.93E-08
1124 1.12E-08 1.12E-08 1.11E-08 1.12E-08 1.12E-08 1.12E-08 1.12E-08
1125 1.13E-08 1.13E-08 1.13E-08 1.13E-08 1.13E-08 1.14E-08 1.13E-08
Biased Statistics
Average Biased
1.18E-08 1.43E-08 1.78E-08 2.06E-08 2.78E-08 2.80E-08 2.63E-08
Std Dev Biased
2.57E-10 2.24E-10 2.98E-10 2.99E-10 4.17E-10 3.55E-10 3.34E-10
Ps99%/90% (+KTL) Biased
1.30E-08 1.54E-08 1.92E-08 2.19E-08 2.98E-08 2.96E-08 2.78E-08
Ps99%/90% (-KTL) Biased
1.06E-08 1.33E-08 1.64E-08 1.92E-08 2.59E-08 2.63E-08 2.47E-08
Un-Biased Statistics
Average Un-Biased
1.14E-08 1.34E-08 1.57E-08 1.74E-08 2.17E-08 2.16E-08 1.97E-08
Std Dev Un-Biased
4.58E-10 5.37E-10 6.07E-10 6.54E-10 7.43E-10 7.44E-10 7.07E-10
Ps99%/90% (+KTL) Un-Biased
1.36E-08 1.59E-08 1.85E-08 2.04E-08 2.52E-08 2.50E-08 2.30E-08
Ps99%/90% (-KTL) Un-Biased
9.28E-09 1.09E-08 1.28E-08 1.43E-08 1.83E-08 1.81E-08 1.64E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 2 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.58. Plot of Positive Bias Current 2 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
123
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.58. Raw data for Positive Bias Current 2 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 2 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.28E-08 1.58E-08 1.95E-08 2.27E-08 3.06E-08 3.07E-08 2.89E-08
1115 1.20E-08 1.46E-08 1.82E-08 2.11E-08 2.85E-08 2.86E-08 2.67E-08
1116 1.14E-08 1.41E-08 1.76E-08 2.03E-08 2.74E-08 2.75E-08 2.56E-08
1117 1.18E-08 1.44E-08 1.80E-08 2.07E-08 2.80E-08 2.81E-08 2.62E-08
1118 1.19E-08 1.45E-08 1.81E-08 2.10E-08 2.84E-08 2.85E-08 2.65E-08
1119 1.11E-08 1.32E-08 1.54E-08 1.71E-08 2.16E-08 2.14E-08 1.93E-08
1120 1.12E-08 1.32E-08 1.55E-08 1.72E-08 2.16E-08 2.15E-08 1.95E-08
1121 1.16E-08 1.36E-08 1.59E-08 1.76E-08 2.19E-08 2.18E-08 1.99E-08
1122 1.27E-08 1.49E-08 1.73E-08 1.93E-08 2.40E-08 2.38E-08 2.17E-08
1123 1.18E-08 1.40E-08 1.63E-08 1.82E-08 2.27E-08 2.25E-08 2.05E-08
1124 1.20E-08 1.19E-08 1.20E-08 1.20E-08 1.20E-08 1.20E-08 1.20E-08
1125 1.12E-08 1.12E-08 1.12E-08 1.12E-08 1.12E-08 1.12E-08 1.12E-08
Biased Statistics
Average Biased
1.20E-08 1.47E-08 1.83E-08 2.12E-08 2.86E-08 2.87E-08 2.68E-08
Std Dev Biased
4.92E-10 6.42E-10 7.38E-10 9.15E-10 1.18E-09 1.21E-09 1.26E-09
Ps99%/90% (+KTL) Biased
1.43E-08 1.77E-08 2.17E-08 2.54E-08 3.41E-08 3.43E-08 3.27E-08
Ps99%/90% (-KTL) Biased
9.70E-09 1.17E-08 1.48E-08 1.69E-08 2.30E-08 2.31E-08 2.09E-08
Un-Biased Statistics
Average Un-Biased
1.17E-08 1.38E-08 1.61E-08 1.79E-08 2.24E-08 2.22E-08 2.02E-08
Std Dev Un-Biased
6.57E-10 7.17E-10 7.84E-10 8.86E-10 1.01E-09 9.85E-10 9.55E-10
Ps99%/90% (+KTL) Un-Biased
1.48E-08 1.71E-08 1.98E-08 2.20E-08 2.71E-08 2.68E-08 2.46E-08
Ps99%/90% (-KTL) Un-Biased
8.63E-09 1.04E-08 1.24E-08 1.37E-08 1.76E-08 1.76E-08 1.57E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 3 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.59. Plot of Positive Bias Current 3 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
125
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.59. Raw data for Positive Bias Current 3 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 3 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.24E-08 1.53E-08 1.89E-08 2.19E-08 2.93E-08 2.95E-08 2.79E-08
1115 1.10E-08 1.34E-08 1.67E-08 1.95E-08 2.65E-08 2.65E-08 2.46E-08
1116 1.06E-08 1.29E-08 1.63E-08 1.89E-08 2.57E-08 2.58E-08 2.39E-08
1117 1.14E-08 1.40E-08 1.73E-08 2.01E-08 2.74E-08 2.74E-08 2.55E-08
1118 1.10E-08 1.35E-08 1.67E-08 1.95E-08 2.65E-08 2.66E-08 2.46E-08
1119 1.04E-08 1.22E-08 1.44E-08 1.59E-08 2.01E-08 1.99E-08 1.82E-08
1120 1.12E-08 1.33E-08 1.57E-08 1.73E-08 2.18E-08 2.16E-08 1.97E-08
1121 1.19E-08 1.39E-08 1.62E-08 1.79E-08 2.22E-08 2.20E-08 2.01E-08
1122 1.23E-08 1.44E-08 1.68E-08 1.86E-08 2.31E-08 2.30E-08 2.10E-08
1123 1.14E-08 1.35E-08 1.57E-08 1.74E-08 2.16E-08 2.15E-08 1.96E-08
1124 1.14E-08 1.13E-08 1.14E-08 1.14E-08 1.14E-08 1.14E-08 1.14E-08
1125 1.07E-08 1.07E-08 1.07E-08 1.08E-08 1.08E-08 1.08E-08 1.07E-08
Biased Statistics
Average Biased
1.13E-08 1.38E-08 1.72E-08 2.00E-08 2.71E-08 2.72E-08 2.53E-08
Std Dev Biased
7.19E-10 8.97E-10 1.00E-09 1.12E-09 1.40E-09 1.42E-09 1.55E-09
Ps99%/90% (+KTL) Biased
1.46E-08 1.80E-08 2.19E-08 2.52E-08 3.36E-08 3.38E-08 3.25E-08
Ps99%/90% (-KTL) Biased
7.91E-09 9.62E-09 1.25E-08 1.48E-08 2.05E-08 2.06E-08 1.81E-08
Un-Biased Statistics
Average Un-Biased
1.14E-08 1.35E-08 1.57E-08 1.74E-08 2.18E-08 2.16E-08 1.97E-08
Std Dev Un-Biased
7.24E-10 8.02E-10 8.55E-10 1.00E-09 1.09E-09 1.12E-09 1.01E-09
Ps99%/90% (+KTL) Un-Biased
1.48E-08 1.72E-08 1.97E-08 2.21E-08 2.69E-08 2.68E-08 2.44E-08
Ps99%/90% (-KTL) Un-Biased
8.04E-09 9.72E-09 1.18E-08 1.27E-08 1.67E-08 1.64E-08 1.50E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Bias Current 4 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.60. Plot of Positive Bias Current 4 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
127
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.60. Raw data for Positive Bias Current 4 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Positive Bias Current 4 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.16E-08 1.41E-08 1.73E-08 2.01E-08 2.72E-08 2.73E-08 2.57E-08
1115 1.26E-08 1.50E-08 1.86E-08 2.14E-08 2.86E-08 2.88E-08 2.72E-08
1116 1.16E-08 1.41E-08 1.75E-08 2.04E-08 2.76E-08 2.78E-08 2.61E-08
1117 1.21E-08 1.47E-08 1.81E-08 2.11E-08 2.85E-08 2.86E-08 2.69E-08
1118 1.24E-08 1.51E-08 1.88E-08 2.18E-08 2.95E-08 2.96E-08 2.79E-08
1119 1.24E-08 1.45E-08 1.71E-08 1.88E-08 2.36E-08 2.34E-08 2.14E-08
1120 1.28E-08 1.49E-08 1.74E-08 1.93E-08 2.42E-08 2.39E-08 2.18E-08
1121 1.20E-08 1.41E-08 1.64E-08 1.82E-08 2.28E-08 2.26E-08 2.05E-08
1122 1.24E-08 1.46E-08 1.70E-08 1.88E-08 2.35E-08 2.33E-08 2.11E-08
1123 1.16E-08 1.36E-08 1.58E-08 1.76E-08 2.19E-08 2.18E-08 1.98E-08
1124 1.16E-08 1.15E-08 1.15E-08 1.16E-08 1.16E-08 1.16E-08 1.16E-08
1125 1.19E-08 1.18E-08 1.18E-08 1.19E-08 1.18E-08 1.19E-08 1.19E-08
Biased Statistics
Average Biased
1.20E-08 1.46E-08 1.80E-08 2.10E-08 2.83E-08 2.84E-08 2.67E-08
Std Dev Biased
4.63E-10 4.88E-10 6.44E-10 6.82E-10 9.07E-10 8.97E-10 8.83E-10
Ps99%/90% (+KTL) Biased
1.42E-08 1.69E-08 2.11E-08 2.41E-08 3.25E-08 3.26E-08 3.09E-08
Ps99%/90% (-KTL) Biased
9.87E-09 1.23E-08 1.50E-08 1.78E-08 2.41E-08 2.42E-08 2.26E-08
Un-Biased Statistics
Average Un-Biased
1.22E-08 1.43E-08 1.67E-08 1.85E-08 2.32E-08 2.30E-08 2.09E-08
Std Dev Un-Biased
4.40E-10 4.90E-10 6.35E-10 6.49E-10 8.64E-10 7.98E-10 7.89E-10
Ps99%/90% (+KTL) Un-Biased
1.43E-08 1.66E-08 1.97E-08 2.16E-08 2.72E-08 2.67E-08 2.46E-08
Ps99%/90% (-KTL) Un-Biased
1.02E-08 1.21E-08 1.38E-08 1.55E-08 1.92E-08 1.93E-08 1.73E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 1 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.61. Plot of Negative Bias Current 1 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
129
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.61. Raw data for Negative Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 1 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.17E-08 1.44E-08 1.77E-08 2.04E-08 2.75E-08 2.77E-08 2.59E-08
1115 1.20E-08 1.46E-08 1.81E-08 2.10E-08 2.83E-08 2.84E-08 2.66E-08
1116 1.15E-08 1.40E-08 1.75E-08 2.03E-08 2.77E-08 2.78E-08 2.62E-08
1117 1.17E-08 1.42E-08 1.77E-08 2.04E-08 2.77E-08 2.78E-08 2.62E-08
1118 1.21E-08 1.46E-08 1.81E-08 2.10E-08 2.84E-08 2.86E-08 2.70E-08
1119 1.14E-08 1.35E-08 1.58E-08 1.76E-08 2.22E-08 2.20E-08 2.00E-08
1120 1.17E-08 1.37E-08 1.61E-08 1.79E-08 2.26E-08 2.25E-08 2.04E-08
1121 1.09E-08 1.28E-08 1.49E-08 1.67E-08 2.08E-08 2.07E-08 1.89E-08
1122 1.20E-08 1.40E-08 1.63E-08 1.81E-08 2.26E-08 2.25E-08 2.05E-08
1123 1.11E-08 1.31E-08 1.53E-08 1.69E-08 2.11E-08 2.11E-08 1.92E-08
1124 1.11E-08 1.11E-08 1.11E-08 1.12E-08 1.11E-08 1.11E-08 1.11E-08
1125 1.14E-08 1.14E-08 1.14E-08 1.14E-08 1.14E-08 1.15E-08 1.14E-08
Biased Statistics
Average Biased
1.18E-08 1.44E-08 1.78E-08 2.06E-08 2.79E-08 2.81E-08 2.64E-08
Std Dev Biased
2.48E-10 2.22E-10 2.83E-10 3.48E-10 4.24E-10 4.13E-10 4.29E-10
Ps99%/90% (+KTL) Biased
1.30E-08 1.54E-08 1.91E-08 2.23E-08 2.99E-08 3.00E-08 2.84E-08
Ps99%/90% (-KTL) Biased
1.07E-08 1.33E-08 1.65E-08 1.90E-08 2.59E-08 2.61E-08 2.44E-08
Un-Biased Statistics
Average Un-Biased
1.14E-08 1.34E-08 1.57E-08 1.74E-08 2.19E-08 2.18E-08 1.98E-08
Std Dev Un-Biased
4.40E-10 4.92E-10 5.57E-10 6.09E-10 8.36E-10 8.46E-10 7.31E-10
Ps99%/90% (+KTL) Un-Biased
1.35E-08 1.57E-08 1.83E-08 2.03E-08 2.58E-08 2.57E-08 2.32E-08
Ps99%/90% (-KTL) Un-Biased
9.37E-09 1.11E-08 1.31E-08 1.46E-08 1.80E-08 1.78E-08 1.64E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 2 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.62. Plot of Negative Bias Current 2 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
131
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.62. Raw data for Negative Bias Current 2 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 2 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.28E-08 1.57E-08 1.95E-08 2.26E-08 3.06E-08 3.08E-08 2.89E-08
1115 1.20E-08 1.46E-08 1.83E-08 2.11E-08 2.87E-08 2.88E-08 2.68E-08
1116 1.15E-08 1.40E-08 1.75E-08 2.01E-08 2.73E-08 2.75E-08 2.56E-08
1117 1.18E-08 1.44E-08 1.78E-08 2.07E-08 2.80E-08 2.81E-08 2.62E-08
1118 1.20E-08 1.47E-08 1.82E-08 2.10E-08 2.87E-08 2.87E-08 2.68E-08
1119 1.09E-08 1.31E-08 1.55E-08 1.73E-08 2.18E-08 2.16E-08 1.95E-08
1120 1.13E-08 1.33E-08 1.56E-08 1.73E-08 2.17E-08 2.16E-08 1.97E-08
1121 1.17E-08 1.37E-08 1.61E-08 1.77E-08 2.20E-08 2.19E-08 2.00E-08
1122 1.26E-08 1.49E-08 1.74E-08 1.93E-08 2.42E-08 2.40E-08 2.19E-08
1123 1.19E-08 1.40E-08 1.63E-08 1.81E-08 2.27E-08 2.25E-08 2.05E-08
1124 1.19E-08 1.19E-08 1.19E-08 1.20E-08 1.19E-08 1.19E-08 1.19E-08
1125 1.13E-08 1.12E-08 1.13E-08 1.13E-08 1.13E-08 1.13E-08 1.13E-08
Biased Statistics
Average Biased
1.20E-08 1.47E-08 1.83E-08 2.11E-08 2.87E-08 2.88E-08 2.68E-08
Std Dev Biased
4.78E-10 6.30E-10 7.67E-10 9.37E-10 1.24E-09 1.26E-09 1.27E-09
Ps99%/90% (+KTL) Biased
1.42E-08 1.76E-08 2.19E-08 2.55E-08 3.44E-08 3.47E-08 3.28E-08
Ps99%/90% (-KTL) Biased
9.78E-09 1.17E-08 1.47E-08 1.67E-08 2.29E-08 2.29E-08 2.09E-08
Un-Biased Statistics
Average Un-Biased
1.17E-08 1.38E-08 1.62E-08 1.79E-08 2.25E-08 2.23E-08 2.03E-08
Std Dev Un-Biased
6.08E-10 6.92E-10 7.70E-10 8.57E-10 1.03E-09 1.01E-09 9.76E-10
Ps99%/90% (+KTL) Un-Biased
1.45E-08 1.70E-08 1.98E-08 2.19E-08 2.73E-08 2.70E-08 2.48E-08
Ps99%/90% (-KTL) Un-Biased
8.83E-09 1.06E-08 1.26E-08 1.39E-08 1.77E-08 1.76E-08 1.57E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 3 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.63. Plot of Negative Bias Current 3 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
133
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.63. Raw data for Negative Bias Current 3 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 3 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.23E-08 1.51E-08 1.87E-08 2.18E-08 2.96E-08 2.97E-08 2.79E-08
1115 1.10E-08 1.34E-08 1.68E-08 1.96E-08 2.66E-08 2.68E-08 2.48E-08
1116 1.05E-08 1.29E-08 1.62E-08 1.89E-08 2.56E-08 2.58E-08 2.38E-08
1117 1.13E-08 1.39E-08 1.73E-08 2.02E-08 2.74E-08 2.75E-08 2.55E-08
1118 1.10E-08 1.35E-08 1.68E-08 1.96E-08 2.65E-08 2.65E-08 2.48E-08
1119 1.03E-08 1.23E-08 1.45E-08 1.61E-08 2.04E-08 2.02E-08 1.83E-08
1120 1.13E-08 1.33E-08 1.56E-08 1.73E-08 2.18E-08 2.16E-08 1.96E-08
1121 1.18E-08 1.39E-08 1.61E-08 1.78E-08 2.22E-08 2.20E-08 2.01E-08
1122 1.23E-08 1.45E-08 1.69E-08 1.88E-08 2.35E-08 2.33E-08 2.12E-08
1123 1.14E-08 1.34E-08 1.56E-08 1.74E-08 2.18E-08 2.16E-08 1.97E-08
1124 1.14E-08 1.14E-08 1.14E-08 1.15E-08 1.14E-08 1.14E-08 1.14E-08
1125 1.08E-08 1.08E-08 1.08E-08 1.08E-08 1.08E-08 1.09E-08 1.08E-08
Biased Statistics
Average Biased
1.12E-08 1.38E-08 1.72E-08 2.00E-08 2.71E-08 2.73E-08 2.54E-08
Std Dev Biased
6.55E-10 8.39E-10 9.55E-10 1.11E-09 1.49E-09 1.53E-09 1.54E-09
Ps99%/90% (+KTL) Biased
1.43E-08 1.77E-08 2.16E-08 2.52E-08 3.41E-08 3.44E-08 3.25E-08
Ps99%/90% (-KTL) Biased
8.17E-09 9.86E-09 1.27E-08 1.48E-08 2.02E-08 2.01E-08 1.82E-08
Un-Biased Statistics
Average Un-Biased
1.14E-08 1.35E-08 1.57E-08 1.75E-08 2.19E-08 2.17E-08 1.98E-08
Std Dev Un-Biased
7.52E-10 8.21E-10 8.91E-10 9.81E-10 1.10E-09 1.12E-09 1.04E-09
Ps99%/90% (+KTL) Un-Biased
1.49E-08 1.73E-08 1.99E-08 2.20E-08 2.71E-08 2.70E-08 2.46E-08
Ps99%/90% (-KTL) Un-Biased
7.90E-09 9.62E-09 1.16E-08 1.29E-08 1.68E-08 1.65E-08 1.49E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
134
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Biased
Ps99%/90% (-KTL) Un-Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Bias Current 4 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.64. Plot of Negative Bias Current 4 @ +5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application
of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or
post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
135
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.64. Raw data for Negative Bias Current 4 @ +5V (A) versus total dose, including the statistical analysis,
specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Negative Bias Current 4 @ +5V (A)
Device
0
10
20
30
50
60
70
1114 1.16E-08 1.41E-08 1.75E-08 2.04E-08 2.75E-08 2.77E-08 2.59E-08
1115 1.25E-08 1.50E-08 1.86E-08 2.16E-08 2.90E-08 2.91E-08 2.74E-08
1116 1.14E-08 1.40E-08 1.75E-08 2.05E-08 2.79E-08 2.80E-08 2.64E-08
1117 1.20E-08 1.46E-08 1.81E-08 2.11E-08 2.86E-08 2.87E-08 2.70E-08
1118 1.25E-08 1.51E-08 1.87E-08 2.18E-08 2.94E-08 2.95E-08 2.79E-08
1119 1.24E-08 1.45E-08 1.71E-08 1.89E-08 2.37E-08 2.36E-08 2.15E-08
1120 1.28E-08 1.50E-08 1.74E-08 1.93E-08 2.44E-08 2.42E-08 2.21E-08
1121 1.20E-08 1.40E-08 1.63E-08 1.80E-08 2.26E-08 2.24E-08 2.05E-08
1122 1.24E-08 1.45E-08 1.68E-08 1.86E-08 2.31E-08 2.29E-08 2.10E-08
1123 1.16E-08 1.35E-08 1.57E-08 1.75E-08 2.18E-08 2.17E-08 1.98E-08
1124 1.16E-08 1.16E-08 1.17E-08 1.17E-08 1.17E-08 1.17E-08 1.17E-08
1125 1.19E-08 1.18E-08 1.18E-08 1.19E-08 1.19E-08 1.19E-08 1.18E-08
Biased Statistics
Average Biased
1.20E-08 1.46E-08 1.81E-08 2.10E-08 2.85E-08 2.86E-08 2.69E-08
Std Dev Biased
5.09E-10 5.07E-10 5.77E-10 6.42E-10 7.94E-10 7.71E-10 7.76E-10
Ps99%/90% (+KTL) Biased
1.44E-08 1.69E-08 2.08E-08 2.40E-08 3.22E-08 3.22E-08 3.05E-08
Ps99%/90% (-KTL) Biased
9.63E-09 1.22E-08 1.54E-08 1.80E-08 2.48E-08 2.50E-08 2.33E-08
Un-Biased Statistics
Average Un-Biased
1.22E-08 1.43E-08 1.67E-08 1.85E-08 2.31E-08 2.29E-08 2.10E-08
Std Dev Un-Biased
4.50E-10 5.75E-10 6.72E-10 7.19E-10 1.02E-09 9.91E-10 9.02E-10
Ps99%/90% (+KTL) Un-Biased
1.43E-08 1.70E-08 1.98E-08 2.18E-08 2.79E-08 2.76E-08 2.52E-08
Ps99%/90% (-KTL) Un-Biased
1.01E-08 1.16E-08 1.35E-08 1.51E-08 1.84E-08 1.83E-08 1.68E-08
Specification MIN
-5.00E-08 -8.00E-08 -1.00E-07 -1.08E-07 -1.25E-07 -1.25E-07 -1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.00E-08 8.00E-08 1.00E-07 1.08E-07 1.25E-07 1.25E-07 1.25E-07
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
136
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 1 RL=open @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.65. Plot of Positive Output Voltage 1 RL=open @ +5V (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
137
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.65. Raw data for Positive Output Voltage 1 RL=open @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 1 RL=open @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.27E+00
4.26E+00
4.27E+00
4.27E+00
4.26E+00
4.28E+00
4.26E+00
4.27E+00
4.27E+00
4.26E+00
4.27E+00
4.27E+00
Total
10
4.27E+00
4.26E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.27E+00
4.27E+00
Dose (krad(Si))
20
30
4.27E+00 4.27E+00
4.26E+00 4.27E+00
4.27E+00 4.27E+00
4.26E+00 4.27E+00
4.26E+00 4.26E+00
4.26E+00 4.27E+00
4.26E+00 4.26E+00
4.26E+00 4.26E+00
4.26E+00 4.26E+00
4.25E+00 4.26E+00
4.27E+00 4.27E+00
4.27E+00 4.27E+00
50
4.30E+00
4.29E+00
4.30E+00
4.29E+00
4.29E+00
4.28E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
24-hr
Anneal
60
4.30E+00
4.29E+00
4.30E+00
4.29E+00
4.29E+00
4.28E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
168-hr
Anneal
70
4.31E+00
4.29E+00
4.30E+00
4.30E+00
4.30E+00
4.29E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00 4.26E+00 4.26E+00 4.27E+00 4.29E+00 4.29E+00 4.30E+00
5.85E-03 2.30E-03 3.87E-03 4.28E-03 5.22E-03 5.55E-03 4.42E-03
4.29E+00 4.28E+00 4.28E+00 4.29E+00 4.32E+00 4.32E+00 4.32E+00
4.24E+00 4.25E+00 4.25E+00 4.25E+00 4.27E+00 4.27E+00 4.28E+00
4.27E+00
7.83E-03
4.31E+00
4.23E+00
4.00E+00
PASS
4.25E+00
4.30E-03
4.27E+00
4.23E+00
4.00E+00
PASS
4.26E+00
3.90E-03
4.27E+00
4.24E+00
4.00E+00
PASS
4.26E+00
3.90E-03
4.28E+00
4.24E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
138
4.27E+00
5.40E-03
4.30E+00
4.25E+00
4.00E+00
PASS
4.27E+00
5.27E-03
4.30E+00
4.25E+00
4.00E+00
PASS
4.28E+00
5.81E-03
4.31E+00
4.25E+00
4.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 2 RL=open @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.66. Plot of Positive Output Voltage 2 RL=open @ +5V (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
139
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.66. Raw data for Positive Output Voltage 2 RL=open @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 2 RL=open @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.25E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
Total
10
4.25E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.24E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.26E+00
4.26E+00
Dose (krad(Si))
20
30
4.25E+00 4.26E+00
4.26E+00 4.26E+00
4.26E+00 4.27E+00
4.26E+00 4.26E+00
4.26E+00 4.26E+00
4.24E+00 4.25E+00
4.25E+00 4.25E+00
4.25E+00 4.25E+00
4.25E+00 4.25E+00
4.25E+00 4.25E+00
4.26E+00 4.27E+00
4.26E+00 4.26E+00
50
4.27E+00
4.28E+00
4.29E+00
4.28E+00
4.28E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
24-hr
Anneal
60
4.27E+00
4.28E+00
4.29E+00
4.28E+00
4.28E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
168-hr
Anneal
70
4.28E+00
4.29E+00
4.31E+00
4.29E+00
4.29E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00 4.25E+00 4.26E+00 4.26E+00 4.28E+00 4.28E+00 4.29E+00
2.30E-03 4.39E-03 3.36E-03 3.70E-03 6.27E-03 6.07E-03 8.70E-03
4.27E+00 4.28E+00 4.27E+00 4.28E+00 4.31E+00 4.31E+00 4.33E+00
4.25E+00 4.23E+00 4.24E+00 4.24E+00 4.25E+00 4.25E+00 4.25E+00
4.26E+00
1.14E-03
4.26E+00
4.25E+00
4.00E+00
PASS
4.24E+00
2.28E-03
4.26E+00
4.23E+00
4.00E+00
PASS
4.25E+00
2.59E-03
4.26E+00
4.24E+00
4.00E+00
PASS
4.25E+00
1.82E-03
4.26E+00
4.24E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
140
4.26E+00
1.92E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
2.19E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
1.64E-03
4.27E+00
4.25E+00
4.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 3 RL=open @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.67. Plot of Positive Output Voltage 3 RL=open @ +5V (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
141
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.67. Raw data for Positive Output Voltage 3 RL=open @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 3 RL=open @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.27E+00
4.27E+00
4.27E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.28E+00
4.27E+00
Total
10
4.26E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.25E+00
4.26E+00
4.26E+00
4.28E+00
4.27E+00
Dose (krad(Si))
20
30
4.27E+00 4.27E+00
4.27E+00 4.27E+00
4.27E+00 4.28E+00
4.27E+00 4.28E+00
4.27E+00 4.28E+00
4.26E+00 4.27E+00
4.26E+00 4.26E+00
4.26E+00 4.26E+00
4.26E+00 4.26E+00
4.26E+00 4.27E+00
4.28E+00 4.28E+00
4.27E+00 4.27E+00
50
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.31E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.28E+00
4.27E+00
24-hr
Anneal
60
4.30E+00
4.31E+00
4.30E+00
4.30E+00
4.31E+00
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.28E+00
4.27E+00
168-hr
Anneal
70
4.30E+00
4.31E+00
4.30E+00
4.31E+00
4.31E+00
4.29E+00
4.28E+00
4.27E+00
4.28E+00
4.28E+00
4.28E+00
4.27E+00
4.27E+00 4.27E+00 4.27E+00 4.28E+00 4.30E+00 4.30E+00 4.31E+00
2.30E-03 4.28E-03 3.05E-03 3.96E-03 3.42E-03 2.28E-03 3.16E-03
4.28E+00 4.29E+00 4.28E+00 4.30E+00 4.32E+00 4.32E+00 4.32E+00
4.26E+00 4.25E+00 4.26E+00 4.26E+00 4.29E+00 4.29E+00 4.29E+00
4.27E+00
2.35E-03
4.28E+00
4.26E+00
4.00E+00
PASS
4.26E+00
1.87E-03
4.26E+00
4.25E+00
4.00E+00
PASS
4.26E+00
2.39E-03
4.27E+00
4.25E+00
4.00E+00
PASS
4.26E+00
2.55E-03
4.27E+00
4.25E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
142
4.27E+00
6.12E-03
4.30E+00
4.24E+00
4.00E+00
PASS
4.27E+00
5.43E-03
4.30E+00
4.25E+00
4.00E+00
PASS
4.28E+00
5.76E-03
4.31E+00
4.25E+00
4.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 4 RL=open @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
3.95E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.68. Plot of Positive Output Voltage 4 RL=open @ +5V (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
143
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.68. Raw data for Positive Output Voltage 4 RL=open @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 4 RL=open @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.26E+00
4.25E+00
4.26E+00
4.26E+00
4.25E+00
4.27E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
Total
10
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
4.24E+00
4.24E+00
4.24E+00
4.24E+00
4.25E+00
4.25E+00
Dose (krad(Si))
20
30
4.26E+00 4.26E+00
4.25E+00 4.25E+00
4.25E+00 4.26E+00
4.25E+00 4.26E+00
4.25E+00 4.25E+00
4.25E+00 4.25E+00
4.24E+00 4.25E+00
4.25E+00 4.25E+00
4.24E+00 4.25E+00
4.24E+00 4.25E+00
4.25E+00 4.25E+00
4.25E+00 4.25E+00
50
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.26E+00
4.25E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
24-hr
Anneal
60
4.28E+00
4.27E+00
4.27E+00
4.27E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00
4.25E+00
168-hr
Anneal
70
4.29E+00
4.28E+00
4.29E+00
4.28E+00
4.28E+00
4.27E+00
4.26E+00
4.26E+00
4.26E+00
4.26E+00
4.25E+00
4.25E+00
4.25E+00 4.25E+00 4.25E+00 4.26E+00 4.27E+00 4.27E+00 4.28E+00
5.22E-03 2.61E-03 3.63E-03 3.74E-03 3.71E-03 3.83E-03 4.32E-03
4.28E+00 4.26E+00 4.27E+00 4.27E+00 4.29E+00 4.29E+00 4.30E+00
4.23E+00 4.24E+00 4.24E+00 4.24E+00 4.25E+00 4.25E+00 4.26E+00
4.25E+00
6.72E-03
4.28E+00
4.22E+00
4.00E+00
PASS
4.24E+00
3.65E-03
4.26E+00
4.22E+00
4.00E+00
PASS
4.24E+00
3.44E-03
4.26E+00
4.23E+00
4.00E+00
PASS
4.25E+00
3.65E-03
4.27E+00
4.23E+00
4.00E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
144
4.26E+00
4.66E-03
4.28E+00
4.23E+00
4.00E+00
PASS
4.26E+00
4.34E-03
4.28E+00
4.24E+00
4.00E+00
PASS
4.26E+00
4.15E-03
4.28E+00
4.24E+00
4.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 1 RL=600 @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.69. Plot of Positive Output Voltage 1 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
145
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.69. Raw data for Positive Output Voltage 1 RL=600 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 1 RL=600 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.82E+00
3.79E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
Total
10
3.82E+00
3.79E+00
3.81E+00
3.81E+00
3.81E+00
3.80E+00
3.79E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
Dose (krad(Si))
20
30
3.82E+00 3.82E+00
3.79E+00 3.79E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.80E+00 3.80E+00
3.79E+00 3.79E+00
3.80E+00 3.80E+00
3.80E+00 3.80E+00
3.80E+00 3.80E+00
3.80E+00 3.80E+00
3.80E+00 3.80E+00
50
3.82E+00
3.79E+00
3.81E+00
3.81E+00
3.81E+00
3.80E+00
3.79E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
24-hr
Anneal
60
3.82E+00
3.79E+00
3.81E+00
3.81E+00
3.81E+00
3.80E+00
3.79E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
168-hr
Anneal
70
3.82E+00
3.79E+00
3.81E+00
3.81E+00
3.81E+00
3.80E+00
3.79E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.80E+00
3.81E+00 3.81E+00 3.81E+00 3.81E+00 3.81E+00 3.81E+00 3.81E+00
8.84E-03 9.15E-03 9.15E-03 9.15E-03 9.56E-03 9.04E-03 9.28E-03
3.85E+00 3.85E+00 3.85E+00 3.85E+00 3.85E+00 3.85E+00 3.85E+00
3.77E+00 3.76E+00 3.76E+00 3.76E+00 3.76E+00 3.76E+00 3.76E+00
3.80E+00
4.56E-03
3.82E+00
3.78E+00
3.40E+00
PASS
3.80E+00
3.96E-03
3.82E+00
3.78E+00
3.40E+00
PASS
3.80E+00
3.56E-03
3.81E+00
3.78E+00
3.20E+00
PASS
3.80E+00
4.16E-03
3.82E+00
3.78E+00
3.13E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
146
3.80E+00
4.15E-03
3.82E+00
3.78E+00
3.00E+00
PASS
3.80E+00
3.94E-03
3.82E+00
3.78E+00
3.00E+00
PASS
3.80E+00
4.34E-03
3.82E+00
3.78E+00
3.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 2 RL=600 @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.70. Plot of Positive Output Voltage 2 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
147
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.70. Raw data for Positive Output Voltage 2 RL=600 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 2 RL=600 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.81E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00
3.82E+00
3.82E+00
3.83E+00
Total
10
3.81E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00
3.82E+00
3.82E+00
3.83E+00
Dose (krad(Si))
20
30
3.81E+00 3.81E+00
3.83E+00 3.83E+00
3.82E+00 3.82E+00
3.82E+00 3.82E+00
3.83E+00 3.83E+00
3.82E+00 3.81E+00
3.82E+00 3.82E+00
3.83E+00 3.83E+00
3.82E+00 3.82E+00
3.82E+00 3.82E+00
3.82E+00 3.82E+00
3.83E+00 3.83E+00
50
3.80E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.81E+00
3.82E+00
3.83E+00
3.81E+00
3.82E+00
3.82E+00
3.83E+00
24-hr
Anneal
60
3.81E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.81E+00
3.82E+00
3.83E+00
3.81E+00
3.82E+00
3.82E+00
3.83E+00
168-hr
Anneal
70
3.80E+00
3.83E+00
3.82E+00
3.82E+00
3.83E+00
3.81E+00
3.82E+00
3.83E+00
3.81E+00
3.82E+00
3.82E+00
3.83E+00
3.82E+00 3.82E+00 3.82E+00 3.82E+00 3.82E+00 3.82E+00 3.82E+00
1.06E-02 1.06E-02 1.07E-02 1.08E-02 1.10E-02 1.08E-02 1.13E-02
3.87E+00 3.87E+00 3.87E+00 3.87E+00 3.87E+00 3.87E+00 3.87E+00
3.77E+00 3.77E+00 3.77E+00 3.77E+00 3.77E+00 3.77E+00 3.77E+00
3.82E+00
4.44E-03
3.84E+00
3.80E+00
3.40E+00
PASS
3.82E+00
5.32E-03
3.84E+00
3.79E+00
3.40E+00
PASS
3.82E+00
4.95E-03
3.84E+00
3.80E+00
3.20E+00
PASS
3.82E+00
5.37E-03
3.84E+00
3.79E+00
3.13E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
148
3.82E+00
5.32E-03
3.84E+00
3.79E+00
3.00E+00
PASS
3.82E+00
5.17E-03
3.84E+00
3.79E+00
3.00E+00
PASS
3.82E+00
5.32E-03
3.84E+00
3.79E+00
3.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 3 RL=600 @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.71. Plot of Positive Output Voltage 3 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
149
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.71. Raw data for Positive Output Voltage 3 RL=600 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 3 RL=600 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.80E+00
3.82E+00
3.81E+00
3.81E+00
3.83E+00
3.81E+00
3.82E+00
3.82E+00
3.81E+00
3.81E+00
3.81E+00
3.82E+00
Total
10
3.80E+00
3.82E+00
3.81E+00
3.81E+00
3.82E+00
3.81E+00
3.81E+00
3.82E+00
3.81E+00
3.81E+00
3.81E+00
3.82E+00
Dose (krad(Si))
20
30
3.80E+00 3.80E+00
3.82E+00 3.82E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.82E+00 3.82E+00
3.80E+00 3.80E+00
3.81E+00 3.81E+00
3.82E+00 3.82E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.82E+00 3.82E+00
50
3.80E+00
3.82E+00
3.81E+00
3.81E+00
3.82E+00
3.80E+00
3.81E+00
3.82E+00
3.81E+00
3.81E+00
3.81E+00
3.82E+00
24-hr
Anneal
60
3.80E+00
3.82E+00
3.81E+00
3.81E+00
3.82E+00
3.80E+00
3.81E+00
3.82E+00
3.81E+00
3.81E+00
3.81E+00
3.82E+00
168-hr
Anneal
70
3.80E+00
3.82E+00
3.81E+00
3.81E+00
3.82E+00
3.80E+00
3.81E+00
3.82E+00
3.81E+00
3.81E+00
3.81E+00
3.82E+00
3.82E+00 3.81E+00 3.81E+00 3.81E+00 3.81E+00 3.81E+00 3.81E+00
1.05E-02 1.05E-02 1.08E-02 1.07E-02 1.12E-02 1.11E-02 1.13E-02
3.86E+00 3.86E+00 3.86E+00 3.86E+00 3.87E+00 3.87E+00 3.87E+00
3.77E+00 3.77E+00 3.76E+00 3.76E+00 3.76E+00 3.76E+00 3.76E+00
3.81E+00
5.07E-03
3.84E+00
3.79E+00
3.40E+00
PASS
3.81E+00
5.77E-03
3.84E+00
3.78E+00
3.40E+00
PASS
3.81E+00
6.12E-03
3.84E+00
3.78E+00
3.20E+00
PASS
3.81E+00
6.35E-03
3.84E+00
3.78E+00
3.13E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
150
3.81E+00
6.50E-03
3.84E+00
3.78E+00
3.00E+00
PASS
3.81E+00
6.14E-03
3.84E+00
3.78E+00
3.00E+00
PASS
3.81E+00
6.06E-03
3.84E+00
3.78E+00
3.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Output Voltage 4 RL=600 @ +5V (V)
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Ps99%/90% (-KTL) Biased
4.50E+00
4.00E+00
3.50E+00
3.00E+00
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.72. Plot of Positive Output Voltage 4 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
151
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Table 5.72. Raw data for Positive Output Voltage 4 RL=600 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Positive Output Voltage 4 RL=600 @ +5V (V)
Device
1114
1115
1116
1117
1118
1119
1120
1121
1122
1123
1124
1125
Biased Statistics
Average Biased
Std Dev Biased
Ps99%/90% (+KTL) Biased
Ps99%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps99%/90% (+KTL) Un-Biased
Ps99%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.83E+00
3.80E+00
3.82E+00
3.82E+00
3.82E+00
3.82E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
Total
10
3.83E+00
3.80E+00
3.82E+00
3.82E+00
3.82E+00
3.81E+00
3.80E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
Dose (krad(Si))
20
30
3.83E+00 3.83E+00
3.80E+00 3.80E+00
3.82E+00 3.82E+00
3.82E+00 3.82E+00
3.82E+00 3.82E+00
3.81E+00 3.81E+00
3.80E+00 3.80E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
3.81E+00 3.81E+00
50
3.82E+00
3.80E+00
3.81E+00
3.82E+00
3.82E+00
3.81E+00
3.80E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
24-hr
Anneal
60
3.83E+00
3.80E+00
3.81E+00
3.82E+00
3.82E+00
3.81E+00
3.80E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
168-hr
Anneal
70
3.82E+00
3.80E+00
3.81E+00
3.82E+00
3.82E+00
3.81E+00
3.80E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.81E+00
3.82E+00 3.82E+00 3.82E+00 3.82E+00 3.81E+00 3.82E+00 3.82E+00
8.37E-03 8.23E-03 8.12E-03 8.47E-03 8.50E-03 8.37E-03 8.63E-03
3.86E+00 3.85E+00 3.85E+00 3.86E+00 3.85E+00 3.85E+00 3.86E+00
3.78E+00 3.78E+00 3.78E+00 3.78E+00 3.77E+00 3.78E+00 3.77E+00
3.81E+00
3.71E-03
3.83E+00
3.79E+00
3.40E+00
PASS
3.81E+00
3.16E-03
3.82E+00
3.79E+00
3.40E+00
PASS
3.81E+00
2.77E-03
3.82E+00
3.80E+00
3.20E+00
PASS
3.81E+00
3.36E-03
3.82E+00
3.79E+00
3.13E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
152
3.81E+00
3.35E-03
3.82E+00
3.79E+00
3.00E+00
PASS
3.81E+00
3.16E-03
3.82E+00
3.79E+00
3.00E+00
PASS
3.81E+00
3.65E-03
3.82E+00
3.79E+00
3.00E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 1 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.73. Plot of Output Voltage Low 1 RL=open @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
153
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.73. Raw data for Output Voltage Low 1 RL=open @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 1 RL=open @ +5V (V)
Device
0
10
20
30
50
60
70
1114 1.40E-02 1.39E-02 1.40E-02 1.42E-02 1.40E-02 1.42E-02 1.42E-02
1115 1.36E-02 1.36E-02 1.37E-02 1.39E-02 1.39E-02 1.40E-02 1.39E-02
1116 1.39E-02 1.39E-02 1.39E-02 1.39E-02 1.40E-02 1.40E-02 1.39E-02
1117 1.38E-02 1.37E-02 1.38E-02 1.39E-02 1.40E-02 1.40E-02 1.40E-02
1118 1.38E-02 1.37E-02 1.40E-02 1.39E-02 1.40E-02 1.40E-02 1.41E-02
1119 1.40E-02 1.38E-02 1.38E-02 1.39E-02 1.40E-02 1.40E-02 1.39E-02
1120 1.37E-02 1.36E-02 1.37E-02 1.38E-02 1.39E-02 1.40E-02 1.38E-02
1121 1.37E-02 1.37E-02 1.38E-02 1.39E-02 1.39E-02 1.40E-02 1.39E-02
1122 1.38E-02 1.37E-02 1.38E-02 1.40E-02 1.40E-02 1.39E-02 1.39E-02
1123 1.37E-02 1.38E-02 1.38E-02 1.39E-02 1.39E-02 1.39E-02 1.40E-02
1124 1.37E-02 1.37E-02 1.37E-02 1.36E-02 1.36E-02 1.38E-02 1.37E-02
1125 1.38E-02 1.36E-02 1.37E-02 1.38E-02 1.38E-02 1.37E-02 1.36E-02
Biased Statistics
Average Biased
1.38E-02 1.38E-02 1.39E-02 1.40E-02 1.40E-02 1.40E-02 1.40E-02
Std Dev Biased
1.48E-04 1.34E-04 1.30E-04 1.34E-04 4.47E-05 8.94E-05 1.30E-04
Ps99%/90% (+KTL) Biased
1.45E-02 1.44E-02 1.45E-02 1.46E-02 1.42E-02 1.45E-02 1.46E-02
Ps99%/90% (-KTL) Biased
1.31E-02 1.31E-02 1.33E-02 1.33E-02 1.38E-02 1.36E-02 1.34E-02
Un-Biased Statistics
Average Un-Biased
1.38E-02 1.37E-02 1.38E-02 1.39E-02 1.39E-02 1.40E-02 1.39E-02
Std Dev Un-Biased
1.30E-04 8.37E-05 4.47E-05 7.07E-05 5.48E-05 5.48E-05 7.07E-05
Ps99%/90% (+KTL) Un-Biased
1.44E-02 1.41E-02 1.40E-02 1.42E-02 1.42E-02 1.42E-02 1.42E-02
Ps99%/90% (-KTL) Un-Biased
1.32E-02 1.33E-02 1.36E-02 1.36E-02 1.37E-02 1.37E-02 1.36E-02
Specification MAX
2.50E-02 2.50E-02 3.00E-02 3.33E-02 4.00E-02 4.00E-02 4.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 2 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.74. Plot of Output Voltage Low 2 RL=open @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
155
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.74. Raw data for Output Voltage Low 2 RL=open @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 2 RL=open @ +5V (V)
Device
0
10
20
30
50
60
70
1114 1.38E-02 1.38E-02 1.38E-02 1.38E-02 1.39E-02 1.39E-02 1.40E-02
1115 1.39E-02 1.39E-02 1.39E-02 1.40E-02 1.41E-02 1.41E-02 1.41E-02
1116 1.39E-02 1.39E-02 1.40E-02 1.39E-02 1.39E-02 1.40E-02 1.40E-02
1117 1.39E-02 1.39E-02 1.40E-02 1.41E-02 1.40E-02 1.39E-02 1.40E-02
1118 1.39E-02 1.39E-02 1.39E-02 1.38E-02 1.40E-02 1.41E-02 1.41E-02
1119 1.38E-02 1.36E-02 1.38E-02 1.37E-02 1.40E-02 1.40E-02 1.39E-02
1120 1.39E-02 1.40E-02 1.41E-02 1.41E-02 1.42E-02 1.42E-02 1.40E-02
1121 1.39E-02 1.40E-02 1.40E-02 1.41E-02 1.41E-02 1.42E-02 1.40E-02
1122 1.39E-02 1.38E-02 1.38E-02 1.40E-02 1.40E-02 1.41E-02 1.41E-02
1123 1.38E-02 1.39E-02 1.39E-02 1.41E-02 1.41E-02 1.41E-02 1.41E-02
1124 1.37E-02 1.36E-02 1.37E-02 1.37E-02 1.38E-02 1.39E-02 1.38E-02
1125 1.39E-02 1.38E-02 1.39E-02 1.38E-02 1.38E-02 1.39E-02 1.39E-02
Biased Statistics
Average Biased
1.39E-02 1.39E-02 1.39E-02 1.39E-02 1.40E-02 1.40E-02 1.40E-02
Std Dev Biased
4.47E-05 4.47E-05 8.37E-05 1.30E-04 8.37E-05 1.00E-04 5.48E-05
Ps99%/90% (+KTL) Biased
1.41E-02 1.41E-02 1.43E-02 1.45E-02 1.44E-02 1.45E-02 1.43E-02
Ps99%/90% (-KTL) Biased
1.37E-02 1.37E-02 1.35E-02 1.33E-02 1.36E-02 1.35E-02 1.38E-02
Un-Biased Statistics
Average Un-Biased
1.39E-02 1.39E-02 1.39E-02 1.40E-02 1.41E-02 1.41E-02 1.40E-02
Std Dev Un-Biased
5.48E-05 1.67E-04 1.30E-04 1.73E-04 8.37E-05 8.37E-05 8.37E-05
Ps99%/90% (+KTL) Un-Biased
1.41E-02 1.46E-02 1.45E-02 1.48E-02 1.45E-02 1.45E-02 1.44E-02
Ps99%/90% (-KTL) Un-Biased
1.36E-02 1.31E-02 1.33E-02 1.32E-02 1.37E-02 1.37E-02 1.36E-02
Specification MAX
2.50E-02 2.50E-02 3.00E-02 3.33E-02 4.00E-02 4.00E-02 4.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 3 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.75. Plot of Output Voltage Low 3 RL=open @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
157
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.75. Raw data for Output Voltage Low 3 RL=open @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 3 RL=open @ +5V (V)
Device
0
10
20
30
50
60
70
1114 1.37E-02 1.38E-02 1.38E-02 1.39E-02 1.41E-02 1.40E-02 1.42E-02
1115 1.40E-02 1.40E-02 1.41E-02 1.41E-02 1.42E-02 1.41E-02 1.42E-02
1116 1.40E-02 1.40E-02 1.41E-02 1.41E-02 1.41E-02 1.41E-02 1.42E-02
1117 1.40E-02 1.39E-02 1.42E-02 1.40E-02 1.42E-02 1.41E-02 1.41E-02
1118 1.40E-02 1.42E-02 1.42E-02 1.41E-02 1.43E-02 1.42E-02 1.42E-02
1119 1.40E-02 1.38E-02 1.38E-02 1.38E-02 1.40E-02 1.39E-02 1.39E-02
1120 1.39E-02 1.41E-02 1.40E-02 1.42E-02 1.43E-02 1.42E-02 1.43E-02
1121 1.41E-02 1.42E-02 1.41E-02 1.42E-02 1.42E-02 1.41E-02 1.42E-02
1122 1.39E-02 1.40E-02 1.40E-02 1.41E-02 1.41E-02 1.42E-02 1.41E-02
1123 1.39E-02 1.38E-02 1.41E-02 1.42E-02 1.41E-02 1.42E-02 1.41E-02
1124 1.38E-02 1.38E-02 1.38E-02 1.39E-02 1.38E-02 1.37E-02 1.40E-02
1125 1.40E-02 1.39E-02 1.38E-02 1.39E-02 1.38E-02 1.39E-02 1.40E-02
Biased Statistics
Average Biased
1.39E-02 1.40E-02 1.41E-02 1.40E-02 1.42E-02 1.41E-02 1.42E-02
Std Dev Biased
1.34E-04 1.48E-04 1.64E-04 8.94E-05 8.37E-05 7.07E-05 4.47E-05
Ps99%/90% (+KTL) Biased
1.46E-02 1.47E-02 1.48E-02 1.45E-02 1.46E-02 1.44E-02 1.44E-02
Ps99%/90% (-KTL) Biased
1.33E-02 1.33E-02 1.33E-02 1.36E-02 1.38E-02 1.38E-02 1.40E-02
Un-Biased Statistics
Average Un-Biased
1.40E-02 1.40E-02 1.40E-02 1.41E-02 1.41E-02 1.41E-02 1.41E-02
Std Dev Un-Biased
8.94E-05 1.79E-04 1.22E-04 1.73E-04 1.14E-04 1.30E-04 1.48E-04
Ps99%/90% (+KTL) Un-Biased
1.44E-02 1.48E-02 1.46E-02 1.49E-02 1.47E-02 1.47E-02 1.48E-02
Ps99%/90% (-KTL) Un-Biased
1.35E-02 1.31E-02 1.34E-02 1.33E-02 1.36E-02 1.35E-02 1.34E-02
Specification MAX
2.50E-02 2.50E-02 3.00E-02 3.33E-02 4.00E-02 4.00E-02 4.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 4 RL=open @ +5V (V)
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24hr
60
Anneal
168hr
70
Anneal
Figure 5.76. Plot of Output Voltage Low 4 RL=open @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
159
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.76. Raw data for Output Voltage Low 4 RL=open @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 4 RL=open @ +5V (V)
Device
0
10
20
30
50
60
70
1114 1.38E-02 1.39E-02 1.40E-02 1.40E-02 1.39E-02 1.40E-02 1.40E-02
1115 1.36E-02 1.37E-02 1.37E-02 1.37E-02 1.38E-02 1.39E-02 1.39E-02
1116 1.39E-02 1.38E-02 1.39E-02 1.37E-02 1.40E-02 1.39E-02 1.39E-02
1117 1.38E-02 1.37E-02 1.40E-02 1.38E-02 1.40E-02 1.40E-02 1.39E-02
1118 1.38E-02 1.37E-02 1.39E-02 1.38E-02 1.40E-02 1.39E-02 1.39E-02
1119 1.38E-02 1.37E-02 1.38E-02 1.39E-02 1.39E-02 1.41E-02 1.40E-02
1120 1.36E-02 1.36E-02 1.36E-02 1.36E-02 1.38E-02 1.38E-02 1.37E-02
1121 1.37E-02 1.37E-02 1.38E-02 1.38E-02 1.40E-02 1.39E-02 1.39E-02
1122 1.38E-02 1.37E-02 1.38E-02 1.38E-02 1.38E-02 1.40E-02 1.39E-02
1123 1.36E-02 1.37E-02 1.37E-02 1.39E-02 1.39E-02 1.39E-02 1.39E-02
1124 1.37E-02 1.37E-02 1.38E-02 1.38E-02 1.37E-02 1.37E-02 1.37E-02
1125 1.36E-02 1.36E-02 1.37E-02 1.37E-02 1.36E-02 1.36E-02 1.37E-02
Biased Statistics
Average Biased
1.38E-02 1.38E-02 1.39E-02 1.38E-02 1.39E-02 1.39E-02 1.39E-02
Std Dev Biased
1.10E-04 8.94E-05 1.22E-04 1.22E-04 8.94E-05 5.48E-05 4.47E-05
Ps99%/90% (+KTL) Biased
1.43E-02 1.42E-02 1.45E-02 1.44E-02 1.44E-02 1.42E-02 1.41E-02
Ps99%/90% (-KTL) Biased
1.33E-02 1.33E-02 1.33E-02 1.32E-02 1.35E-02 1.37E-02 1.37E-02
Un-Biased Statistics
Average Un-Biased
1.37E-02 1.37E-02 1.37E-02 1.38E-02 1.39E-02 1.39E-02 1.39E-02
Std Dev Un-Biased
1.00E-04 4.47E-05 8.94E-05 1.22E-04 8.37E-05 1.14E-04 1.10E-04
Ps99%/90% (+KTL) Un-Biased
1.42E-02 1.39E-02 1.42E-02 1.44E-02 1.43E-02 1.45E-02 1.44E-02
Ps99%/90% (-KTL) Un-Biased
1.32E-02 1.35E-02 1.33E-02 1.32E-02 1.35E-02 1.34E-02 1.34E-02
Specification MAX
2.50E-02 2.50E-02 3.00E-02 3.33E-02 4.00E-02 4.00E-02 4.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 1 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.77. Plot of Output Voltage Low 1 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
161
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.77. Raw data for Output Voltage Low 1 RL=600 @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 1 RL=600 @ +5V (V)
Device
0
10
20
30
50
60
70
1114 5.30E-03 5.30E-03 5.40E-03 5.30E-03 5.30E-03 5.20E-03 5.10E-03
1115 5.20E-03 5.20E-03 5.30E-03 5.20E-03 5.10E-03 5.20E-03 5.00E-03
1116 5.20E-03 5.20E-03 5.10E-03 5.30E-03 5.10E-03 5.10E-03 5.00E-03
1117 5.20E-03 5.30E-03 5.40E-03 5.30E-03 5.20E-03 5.20E-03 5.10E-03
1118 5.40E-03 5.20E-03 5.30E-03 5.20E-03 5.20E-03 5.20E-03 5.00E-03
1119 5.20E-03 5.30E-03 5.30E-03 5.20E-03 5.20E-03 5.20E-03 5.10E-03
1120 5.30E-03 5.40E-03 5.40E-03 5.30E-03 5.30E-03 5.30E-03 5.30E-03
1121 5.30E-03 5.30E-03 5.20E-03 5.30E-03 5.20E-03 5.20E-03 5.30E-03
1122 5.30E-03 5.30E-03 5.30E-03 5.30E-03 5.20E-03 5.10E-03 5.10E-03
1123 5.40E-03 5.40E-03 5.40E-03 5.40E-03 5.20E-03 5.30E-03 5.30E-03
1124 5.20E-03 5.20E-03 5.20E-03 5.20E-03 5.30E-03 5.20E-03 5.30E-03
1125 5.20E-03 5.10E-03 5.20E-03 5.20E-03 5.20E-03 5.20E-03 5.30E-03
Biased Statistics
Average Biased
5.26E-03 5.24E-03 5.30E-03 5.26E-03 5.18E-03 5.18E-03 5.04E-03
Std Dev Biased
8.94E-05 5.48E-05 1.22E-04 5.48E-05 8.37E-05 4.47E-05 5.48E-05
Ps99%/90% (+KTL) Biased
5.68E-03 5.50E-03 5.87E-03 5.52E-03 5.57E-03 5.39E-03 5.30E-03
Ps99%/90% (-KTL) Biased
4.84E-03 4.98E-03 4.73E-03 5.00E-03 4.79E-03 4.97E-03 4.78E-03
Un-Biased Statistics
Average Un-Biased
5.30E-03 5.34E-03 5.32E-03 5.30E-03 5.22E-03 5.22E-03 5.22E-03
Std Dev Un-Biased
7.07E-05 5.48E-05 8.37E-05 7.07E-05 4.47E-05 8.37E-05 1.10E-04
Ps99%/90% (+KTL) Un-Biased
5.63E-03 5.60E-03 5.71E-03 5.63E-03 5.43E-03 5.61E-03 5.73E-03
Ps99%/90% (-KTL) Un-Biased
4.97E-03 5.08E-03 4.93E-03 4.97E-03 5.01E-03 4.83E-03 4.71E-03
Specification MAX
1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
162
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 2 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.78. Plot of Output Voltage Low 2 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
163
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.78. Raw data for Output Voltage Low 2 RL=600 @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 2 RL=600 @ +5V (V)
Device
0
10
20
30
50
60
70
1114 5.50E-03 5.50E-03 5.40E-03 5.50E-03 5.30E-03 5.30E-03 5.30E-03
1115 5.60E-03 5.70E-03 5.60E-03 5.70E-03 5.50E-03 5.60E-03 5.30E-03
1116 5.50E-03 5.70E-03 5.70E-03 5.50E-03 5.30E-03 5.40E-03 5.30E-03
1117 5.70E-03 5.70E-03 5.60E-03 5.60E-03 5.50E-03 5.40E-03 5.40E-03
1118 5.60E-03 5.60E-03 5.70E-03 5.50E-03 5.40E-03 5.30E-03 5.40E-03
1119 5.60E-03 5.70E-03 5.60E-03 5.60E-03 5.60E-03 5.40E-03 5.50E-03
1120 5.60E-03 5.70E-03 5.60E-03 5.60E-03 5.50E-03 5.60E-03 5.60E-03
1121 5.60E-03 5.70E-03 5.80E-03 5.60E-03 5.70E-03 5.60E-03 5.60E-03
1122 5.60E-03 5.70E-03 5.50E-03 5.50E-03 5.50E-03 5.60E-03 5.50E-03
1123 5.60E-03 5.50E-03 5.60E-03 5.60E-03 5.50E-03 5.40E-03 5.60E-03
1124 5.50E-03 5.60E-03 5.50E-03 5.60E-03 5.50E-03 5.60E-03 5.60E-03
1125 5.50E-03 5.60E-03 5.60E-03 5.70E-03 5.70E-03 5.70E-03 5.50E-03
Biased Statistics
Average Biased
5.58E-03 5.64E-03 5.60E-03 5.56E-03 5.40E-03 5.40E-03 5.34E-03
Std Dev Biased
8.37E-05 8.94E-05 1.22E-04 8.94E-05 1.00E-04 1.22E-04 5.48E-05
Ps99%/90% (+KTL) Biased
5.97E-03 6.06E-03 6.17E-03 5.98E-03 5.87E-03 5.97E-03 5.60E-03
Ps99%/90% (-KTL) Biased
5.19E-03 5.22E-03 5.03E-03 5.14E-03 4.93E-03 4.83E-03 5.08E-03
Un-Biased Statistics
Average Un-Biased
5.60E-03 5.66E-03 5.62E-03 5.58E-03 5.56E-03 5.52E-03 5.56E-03
Std Dev Un-Biased
0.00E+00 8.94E-05 1.10E-04 4.47E-05 8.94E-05 1.10E-04 5.48E-05
Ps99%/90% (+KTL) Un-Biased
5.60E-03 6.08E-03 6.13E-03 5.79E-03 5.98E-03 6.03E-03 5.82E-03
Ps99%/90% (-KTL) Un-Biased
5.60E-03 5.24E-03 5.11E-03 5.37E-03 5.14E-03 5.01E-03 5.30E-03
Specification MAX
1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
164
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 3 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.79. Plot of Output Voltage Low 3 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
165
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.79. Raw data for Output Voltage Low 3 RL=600 @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 3 RL=600 @ +5V (V)
Device
0
10
20
30
50
60
70
1114 5.20E-03 5.30E-03 5.40E-03 5.20E-03 5.10E-03 5.00E-03 5.00E-03
1115 5.50E-03 5.40E-03 5.60E-03 5.30E-03 5.40E-03 5.20E-03 5.30E-03
1116 5.40E-03 5.40E-03 5.30E-03 5.40E-03 5.20E-03 5.20E-03 5.10E-03
1117 5.50E-03 5.40E-03 5.40E-03 5.50E-03 5.30E-03 5.40E-03 5.20E-03
1118 5.30E-03 5.40E-03 5.50E-03 5.30E-03 5.30E-03 5.20E-03 5.20E-03
1119 5.40E-03 5.50E-03 5.40E-03 5.40E-03 5.30E-03 5.30E-03 5.30E-03
1120 5.40E-03 5.40E-03 5.40E-03 5.40E-03 5.40E-03 5.30E-03 5.30E-03
1121 5.40E-03 5.50E-03 5.50E-03 5.50E-03 5.40E-03 5.40E-03 5.40E-03
1122 5.30E-03 5.20E-03 5.40E-03 5.40E-03 5.30E-03 5.20E-03 5.20E-03
1123 5.20E-03 5.40E-03 5.40E-03 5.40E-03 5.20E-03 5.30E-03 5.40E-03
1124 5.20E-03 5.30E-03 5.20E-03 5.30E-03 5.30E-03 5.30E-03 5.30E-03
1125 5.40E-03 5.40E-03 5.30E-03 5.50E-03 5.60E-03 5.60E-03 5.50E-03
Biased Statistics
Average Biased
5.38E-03 5.38E-03 5.44E-03 5.34E-03 5.26E-03 5.20E-03 5.16E-03
Std Dev Biased
1.30E-04 4.47E-05 1.14E-04 1.14E-04 1.14E-04 1.41E-04 1.14E-04
Ps99%/90% (+KTL) Biased
5.99E-03 5.59E-03 5.97E-03 5.87E-03 5.79E-03 5.86E-03 5.69E-03
Ps99%/90% (-KTL) Biased
4.77E-03 5.17E-03 4.91E-03 4.81E-03 4.73E-03 4.54E-03 4.63E-03
Un-Biased Statistics
Average Un-Biased
5.34E-03 5.40E-03 5.42E-03 5.42E-03 5.32E-03 5.30E-03 5.32E-03
Std Dev Un-Biased
8.94E-05 1.22E-04 4.47E-05 4.47E-05 8.37E-05 7.07E-05 8.37E-05
Ps99%/90% (+KTL) Un-Biased
5.76E-03 5.97E-03 5.63E-03 5.63E-03 5.71E-03 5.63E-03 5.71E-03
Ps99%/90% (-KTL) Un-Biased
4.92E-03 4.83E-03 5.21E-03 5.21E-03 4.93E-03 4.97E-03 4.93E-03
Specification MAX
1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
166
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 4 RL=600 @ +5V (V)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.80. Plot of Output Voltage Low 4 RL=600 @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
167
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.80. Raw data for Output Voltage Low 4 RL=600 @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 4 RL=600 @ +5V (V)
Device
0
10
20
30
50
60
70
1114 5.80E-03 5.60E-03 5.60E-03 5.70E-03 5.50E-03 5.40E-03 5.40E-03
1115 5.60E-03 5.40E-03 5.50E-03 5.60E-03 5.30E-03 5.40E-03 5.40E-03
1116 5.50E-03 5.50E-03 5.40E-03 5.50E-03 5.30E-03 5.20E-03 5.30E-03
1117 5.60E-03 5.50E-03 5.60E-03 5.60E-03 5.50E-03 5.40E-03 5.30E-03
1118 5.60E-03 5.60E-03 5.60E-03 5.60E-03 5.40E-03 5.50E-03 5.50E-03
1119 5.50E-03 5.50E-03 5.50E-03 5.60E-03 5.50E-03 5.50E-03 5.50E-03
1120 5.40E-03 5.50E-03 5.60E-03 5.50E-03 5.40E-03 5.50E-03 5.40E-03
1121 5.50E-03 5.50E-03 5.50E-03 5.50E-03 5.50E-03 5.40E-03 5.50E-03
1122 5.50E-03 5.50E-03 5.60E-03 5.50E-03 5.30E-03 5.50E-03 5.50E-03
1123 5.50E-03 5.50E-03 5.70E-03 5.50E-03 5.60E-03 5.50E-03 5.60E-03
1124 5.60E-03 5.40E-03 5.50E-03 5.50E-03 5.50E-03 5.50E-03 5.60E-03
1125 5.40E-03 5.50E-03 5.40E-03 5.50E-03 5.50E-03 5.50E-03 5.50E-03
Biased Statistics
Average Biased
5.62E-03 5.52E-03 5.54E-03 5.60E-03 5.40E-03 5.38E-03 5.38E-03
Std Dev Biased
1.10E-04 8.37E-05 8.94E-05 7.07E-05 1.00E-04 1.10E-04 8.37E-05
Ps99%/90% (+KTL) Biased
6.13E-03 5.91E-03 5.96E-03 5.93E-03 5.87E-03 5.89E-03 5.77E-03
Ps99%/90% (-KTL) Biased
5.11E-03 5.13E-03 5.12E-03 5.27E-03 4.93E-03 4.87E-03 4.99E-03
Un-Biased Statistics
Average Un-Biased
5.48E-03 5.50E-03 5.58E-03 5.52E-03 5.46E-03 5.48E-03 5.50E-03
Std Dev Un-Biased
4.47E-05 0.00E+00 8.37E-05 4.47E-05 1.14E-04 4.47E-05 7.07E-05
Ps99%/90% (+KTL) Un-Biased
5.69E-03 5.50E-03 5.97E-03 5.73E-03 5.99E-03 5.69E-03 5.83E-03
Ps99%/90% (-KTL) Un-Biased
5.27E-03 5.50E-03 5.19E-03 5.31E-03 4.93E-03 5.27E-03 5.17E-03
Specification MAX
1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
168
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 1 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.81. Plot of Output Voltage Low 1 IL=1mA @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
169
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.81. Raw data for Output Voltage Low 1 IL=1mA @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 1 IL=1mA @ +5V (V)
Device
0
10
20
30
50
60
70
1114 2.46E-01 2.44E-01 2.44E-01 2.46E-01 2.50E-01 2.51E-01 2.52E-01
1115 2.46E-01 2.45E-01 2.45E-01 2.46E-01 2.51E-01 2.52E-01 2.53E-01
1116 2.48E-01 2.46E-01 2.46E-01 2.47E-01 2.53E-01 2.54E-01 2.55E-01
1117 2.45E-01 2.44E-01 2.44E-01 2.45E-01 2.50E-01 2.50E-01 2.52E-01
1118 2.46E-01 2.45E-01 2.45E-01 2.46E-01 2.51E-01 2.52E-01 2.53E-01
1119 2.53E-01 2.45E-01 2.46E-01 2.47E-01 2.50E-01 2.51E-01 2.51E-01
1120 2.46E-01 2.41E-01 2.42E-01 2.44E-01 2.47E-01 2.48E-01 2.47E-01
1121 2.42E-01 2.38E-01 2.39E-01 2.41E-01 2.44E-01 2.44E-01 2.44E-01
1122 2.46E-01 2.42E-01 2.43E-01 2.44E-01 2.47E-01 2.47E-01 2.47E-01
1123 2.44E-01 2.40E-01 2.41E-01 2.43E-01 2.45E-01 2.45E-01 2.46E-01
1124 2.47E-01 2.45E-01 2.45E-01 2.46E-01 2.46E-01 2.47E-01 2.45E-01
1125 2.47E-01 2.46E-01 2.46E-01 2.46E-01 2.46E-01 2.47E-01 2.45E-01
Biased Statistics
Average Biased
2.46E-01 2.45E-01 2.45E-01 2.46E-01 2.51E-01 2.52E-01 2.53E-01
Std Dev Biased
1.10E-03 8.37E-04 8.37E-04 7.07E-04 1.22E-03 1.48E-03 1.22E-03
Ps99%/90% (+KTL) Biased
2.51E-01 2.49E-01 2.49E-01 2.49E-01 2.57E-01 2.59E-01 2.59E-01
Ps99%/90% (-KTL) Biased
2.41E-01 2.41E-01 2.41E-01 2.43E-01 2.45E-01 2.45E-01 2.47E-01
Un-Biased Statistics
Average Un-Biased
2.46E-01 2.41E-01 2.42E-01 2.44E-01 2.47E-01 2.47E-01 2.47E-01
Std Dev Un-Biased
4.15E-03 2.59E-03 2.59E-03 2.17E-03 2.30E-03 2.74E-03 2.55E-03
Ps99%/90% (+KTL) Un-Biased
2.66E-01 2.53E-01 2.54E-01 2.54E-01 2.57E-01 2.60E-01 2.59E-01
Ps99%/90% (-KTL) Un-Biased
2.27E-01 2.29E-01 2.30E-01 2.34E-01 2.36E-01 2.34E-01 2.35E-01
Specification MAX
3.50E-01 6.00E-01 8.00E-01 8.67E-01 1.00E+00 1.00E+00 1.00E+00
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
170
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 2 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.82. Plot of Output Voltage Low 2 IL=1mA @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
171
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.82. Raw data for Output Voltage Low 2 IL=1mA @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 2 IL=1mA @ +5V (V)
Device
0
10
20
30
50
60
70
1114 2.46E-01 2.44E-01 2.45E-01 2.46E-01 2.50E-01 2.52E-01 2.52E-01
1115 2.42E-01 2.41E-01 2.41E-01 2.42E-01 2.46E-01 2.48E-01 2.47E-01
1116 2.40E-01 2.39E-01 2.39E-01 2.41E-01 2.46E-01 2.47E-01 2.47E-01
1117 2.40E-01 2.39E-01 2.39E-01 2.41E-01 2.45E-01 2.46E-01 2.47E-01
1118 2.42E-01 2.40E-01 2.40E-01 2.41E-01 2.46E-01 2.46E-01 2.47E-01
1119 2.40E-01 2.34E-01 2.35E-01 2.36E-01 2.40E-01 2.40E-01 2.39E-01
1120 2.43E-01 2.39E-01 2.40E-01 2.41E-01 2.44E-01 2.44E-01 2.43E-01
1121 2.39E-01 2.36E-01 2.37E-01 2.38E-01 2.40E-01 2.41E-01 2.39E-01
1122 2.46E-01 2.42E-01 2.43E-01 2.45E-01 2.47E-01 2.48E-01 2.46E-01
1123 2.42E-01 2.38E-01 2.39E-01 2.41E-01 2.42E-01 2.44E-01 2.43E-01
1124 2.45E-01 2.43E-01 2.43E-01 2.44E-01 2.44E-01 2.45E-01 2.44E-01
1125 2.42E-01 2.40E-01 2.40E-01 2.41E-01 2.40E-01 2.41E-01 2.40E-01
Biased Statistics
Average Biased
2.42E-01 2.41E-01 2.41E-01 2.42E-01 2.47E-01 2.48E-01 2.48E-01
Std Dev Biased
2.45E-03 2.07E-03 2.49E-03 2.17E-03 1.95E-03 2.49E-03 2.24E-03
Ps99%/90% (+KTL) Biased
2.53E-01 2.50E-01 2.52E-01 2.52E-01 2.56E-01 2.59E-01 2.58E-01
Ps99%/90% (-KTL) Biased
2.31E-01 2.31E-01 2.29E-01 2.32E-01 2.38E-01 2.36E-01 2.38E-01
Un-Biased Statistics
Average Un-Biased
2.42E-01 2.38E-01 2.39E-01 2.40E-01 2.43E-01 2.43E-01 2.42E-01
Std Dev Un-Biased
2.74E-03 3.03E-03 3.03E-03 3.42E-03 2.97E-03 3.13E-03 3.00E-03
Ps99%/90% (+KTL) Un-Biased
2.55E-01 2.52E-01 2.53E-01 2.56E-01 2.56E-01 2.58E-01 2.56E-01
Ps99%/90% (-KTL) Un-Biased
2.29E-01 2.24E-01 2.25E-01 2.24E-01 2.29E-01 2.29E-01 2.28E-01
Specification MAX
3.50E-01 6.00E-01 8.00E-01 8.67E-01 1.00E+00 1.00E+00 1.00E+00
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
172
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 3 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.83. Plot of Output Voltage Low 3 IL=1mA @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
173
ELDRS Report
10-493 110223 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.83. Raw data for Output Voltage Low 3 IL=1mA @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 3 IL=1mA @ +5V (V)
Device
0
10
20
30
50
60
70
1114 2.52E-01 2.49E-01 2.51E-01 2.52E-01 2.57E-01 2.58E-01 2.59E-01
1115 2.47E-01 2.46E-01 2.46E-01 2.47E-01 2.52E-01 2.53E-01 2.54E-01
1116 2.46E-01 2.44E-01 2.44E-01 2.46E-01 2.52E-01 2.53E-01 2.54E-01
1117 2.46E-01 2.43E-01 2.44E-01 2.46E-01 2.51E-01 2.52E-01 2.53E-01
1118 2.47E-01 2.46E-01 2.46E-01 2.47E-01 2.53E-01 2.53E-01 2.55E-01
1119 2.46E-01 2.40E-01 2.41E-01 2.42E-01 2.46E-01 2.47E-01 2.46E-01
1120 2.48E-01 2.43E-01 2.44E-01 2.45E-01 2.48E-01 2.49E-01 2.48E-01
1121 2.45E-01 2.40E-01 2.41E-01 2.42E-01 2.44E-01 2.45E-01 2.44E-01
1122 2.52E-01 2.47E-01 2.48E-01 2.50E-01 2.52E-01 2.53E-01 2.52E-01
1123 2.48E-01 2.43E-01 2.44E-01 2.45E-01 2.47E-01 2.49E-01 2.48E-01
1124 2.50E-01 2.49E-01 2.48E-01 2.50E-01 2.49E-01 2.50E-01 2.48E-01
1125 2.46E-01 2.45E-01 2.45E-01 2.46E-01 2.45E-01 2.46E-01 2.45E-01
Biased Statistics
Average Biased
2.48E-01 2.46E-01 2.46E-01 2.48E-01 2.53E-01 2.54E-01 2.55E-01
Std Dev Biased
2.51E-03 2.30E-03 2.86E-03 2.51E-03 2.35E-03 2.39E-03 2.35E-03
Ps99%/90% (+KTL) Biased
2.59E-01 2.56E-01 2.60E-01 2.59E-01 2.64E-01 2.65E-01 2.66E-01
Ps99%/90% (-KTL) Biased
2.36E-01 2.35E-01 2.33E-01 2.36E-01 2.42E-01 2.43E-01 2.44E-01
Un-Biased Statistics
Average Un-Biased
2.48E-01 2.43E-01 2.44E-01 2.45E-01 2.47E-01 2.49E-01 2.48E-01
Std Dev Un-Biased
2.68E-03 2.88E-03 2.88E-03 3.27E-03 2.97E-03 2.97E-03 2.97E-03
Ps99%/90% (+KTL) Un-Biased
2.60E-01 2.56E-01 2.57E-01 2.60E-01 2.61E-01 2.62E-01 2.61E-01
Ps99%/90% (-KTL) Un-Biased
2.35E-01 2.29E-01 2.30E-01 2.30E-01 2.34E-01 2.35E-01 2.34E-01
Specification MAX
3.50E-01 6.00E-01 8.00E-01 8.67E-01 1.00E+00 1.00E+00 1.00E+00
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
174
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-493 110223 R1.0
Average Biased
Average Un-Biased
Ps99%/90% (+KTL) Un-Biased
Specification MAX
Ps99%/90% (+KTL) Biased
Output Voltage Low 4 IL=1mA @ +5V (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24hr
60
Anneal
168hr
70
Anneal
Figure 5.84. Plot of Output Voltage Low 4 IL=1mA @ +5V (V) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
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Table 5.84. Raw data for Output Voltage Low 4 IL=1mA @ +5V (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Total Dose (krad(Si))
Anneal
Anneal
Output Voltage Low 4 IL=1mA @ +5V (V)
Device
0
10
20
30
50
60
70
1114 2.41E-01 2.39E-01 2.40E-01 2.41E-01 2.45E-01 2.46E-01 2.46E-01
1115 2.40E-01 2.39E-01 2.39E-01 2.41E-01 2.45E-01 2.46E-01 2.46E-01
1116 2.42E-01 2.41E-01 2.41E-01 2.42E-01 2.47E-01 2.48E-01 2.48E-01
1117 2.41E-01 2.39E-01 2.40E-01 2.41E-01 2.45E-01 2.46E-01 2.47E-01
1118 2.42E-01 2.41E-01 2.41E-01 2.42E-01 2.46E-01 2.47E-01 2.48E-01
1119 2.46E-01 2.40E-01 2.40E-01 2.42E-01 2.45E-01 2.45E-01 2.45E-01
1120 2.40E-01 2.36E-01 2.37E-01 2.38E-01 2.41E-01 2.42E-01 2.41E-01
1121 2.37E-01 2.34E-01 2.35E-01 2.36E-01 2.39E-01 2.39E-01 2.38E-01
1122 2.41E-01 2.36E-01 2.37E-01 2.39E-01 2.41E-01 2.42E-01 2.41E-01
1123 2.40E-01 2.36E-01 2.36E-01 2.38E-01 2.40E-01 2.41E-01 2.41E-01
1124 2.42E-01 2.40E-01 2.40E-01 2.41E-01 2.41E-01 2.42E-01 2.40E-01
1125 2.41E-01 2.40E-01 2.40E-01 2.41E-01 2.40E-01 2.41E-01 2.40E-01
Biased Statistics
Average Biased
2.41E-01 2.40E-01 2.40E-01 2.41E-01 2.46E-01 2.47E-01 2.47E-01
Std Dev Biased
8.37E-04 1.10E-03 8.37E-04 5.48E-04 8.94E-04 8.94E-04 1.00E-03
Ps99%/90% (+KTL) Biased
2.45E-01 2.45E-01 2.44E-01 2.44E-01 2.50E-01 2.51E-01 2.52E-01
Ps99%/90% (-KTL) Biased
2.37E-01 2.35E-01 2.36E-01 2.39E-01 2.41E-01 2.42E-01 2.42E-01
Un-Biased Statistics
Average Un-Biased
2.41E-01 2.36E-01 2.37E-01 2.39E-01 2.41E-01 2.42E-01 2.41E-01
Std Dev Un-Biased
3.27E-03 2.19E-03 1.87E-03 2.19E-03 2.28E-03 2.17E-03 2.49E-03
Ps99%/90% (+KTL) Un-Biased
2.56E-01 2.47E-01 2.46E-01 2.49E-01 2.52E-01 2.52E-01 2.53E-01
Ps99%/90% (-KTL) Un-Biased
2.26E-01 2.26E-01 2.28E-01 2.28E-01 2.31E-01 2.32E-01 2.30E-01
Specification MAX
3.50E-01 6.00E-01 8.00E-01 8.67E-01 1.00E+00 1.00E+00 1.00E+00
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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6.0. Summary / Conclusions
The low dose rate testing described in this final report was performed using the facilities at Radiation
Assured Devices' Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the
irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic
timer/controller and the exposure is performed in air. The dose rate for this irradiator in this
configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s,
determined by the distance from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could
be logged as a failure.
Based on this criterion the RH1014MW Quad Precision Operational Amplifier (from the lot date code
identified on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the
maximum tested dose level of 50krad(Si) with all parameters remaining within their datasheet
specifications. Further, the data in this report can be analyzed along with the high dose rate report titled
"Total Ionizing Dose (TID) Radiation Testing of the RH1014MW Quad Precision Operational Amplifier
for Linear Technology" to demonstrate that these parts do not exhibit ELDRS as defined in the current
test method.
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Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Traceability
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Appendix B: Radiation Bias Connections
ELDRS Radiation Biased Conditions: Extracted from Linear Technology RH1014 Quad Precision
Operational Amplifier Datasheet.
Pin Function
Connection / Bias
1
OUT A
To Pin 2 Via 10k Resistor
2
-IN A
To Pin 1 Via 10k Resistor
3
+IN A
8V Via 10k Resistor
4
V+
5
+IN B
8V Via 10k Resistor
6
-IN B
To Pin 7 Via 10k Resistor
7
OUT B
To Pin 6 Via 10k Resistor
8
OUT C
To Pin 9 Via 10k Resistor
9
-IN C
To Pin 8 Via 10k Resistor
10
+IN C
8V Via 10k Resistor
11
V-
12
+IN D
8V Via 10k Resistor
13
-IN D
To Pin 14 Via 10k Resistor
14
OUT D
To Pin 13 Via 10k Resistor
+15V Decoupled to GND W/ 0.1F
-15V Decoupled to GND W/ 0.1F
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ELDRS Radiation Unbiased Conditions: All pins connected to Ground.
Pin Function Connection / Bias
1
OUT A
GND
2
-IN A
GND
3
+IN A
GND
4
V+
GND
5
+IN B
GND
6
-IN B
GND
7
OUT B
GND
8
OUT C
GND
9
-IN C
GND
10
+IN C
GND
11
V-
GND
12
+IN D
GND
13
-IN D
GND
14
OUT D
GND
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Figure B.1. Irradiation bias circuit for the units to be irradiated under electrical bias. This figure was extracted
from Linear Technology RH1014M Quad Precision Operational Amplifier Datasheet.
Figure B.2. Package drawing (for reference only). This figure was extracted from Linear Technology RH1014M
Quad Precision Operational Amplifier Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
RH1014M Quad Precision Operational Amplifier Datasheet. All electrical tests for this device are
performed on one of Radiation Assured Device's LTS2020 Test Systems. The LTS2020 Test System is a
programmable parametric tester that provides parameter measurements for a variety of digital, analog
and mixed signal products including voltage regulators, voltage comparators, D to A and A to D
converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software
self-calibration and an internal relay matrix with separate family boards and custom personality adapter
boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate
voltage / current sources and establish the needed measurement loops for all the tests performed. The
measured parameters and test conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020
for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table
C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between
tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90
KTL statistics were applied to the measured standard deviation to generate the final measurement range.
This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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Table C.1. Measured parameters, test conditions, and acceptance criteria for the RH1014MW Quad Precision
Operational Amplifier.
Parameter
Test Conditions
Positive Supply Current (ICC+)
VS=±15V
Negative Supply Current (IEE-)
VS=±15V
Input Offset Voltage (VOS1-VOS4)
VS=±15V
Input Offset Current (IOS1-IOS4)
VS=±15V
+ Input Bias Current (IB+1-IB+4)
VS=±15V
- Input Bias Current (IB-1-IB-4)
VS=±15V
Common Mode Rejection Ratio (CMRR1-CMRR4)
VCM = 13.5V, –15V
Power Supply Rejection Ratio (PSRR1-PSRR4)
VS = ±10V to ±18V
Large Signal Voltage Gain (AVOL9-AVOL12)
VS=±15V, VO = ±10V, RL = 10k
Positive Output Voltage Swing (VOUT+1-VOUT+4)
VS=±15V, RL= 10k
Negative Output Voltage Swing (VOUT-1-VOUT-4)
VS=±15V, RL= 10k
Positive Slew Rate (SlewRate+1 – SlewRate+4)
VS=±15V, RL= 10k
Negative Slew Rate (SlewRate-1 – SlewRate-4)
VS=±15V, RL= 10k
Positive Supply Current (ICC+2)
VS=+5V
Negative Supply Current (IEE-2)
VS=+5V
Input Offset Voltage (VOS5-VOS8)
VS=+5V
Input Offset Current (IOS5-IOS8)
VS=+5V
+ Input Bias Current (IB+5-IB+8)
VS=+5V
- Input Bias Current (IB-5-IB-8)
VS=+5V
Positive Output Voltage Swing (VOUT+5-VOUT+8)
VS=+5V, No Load
Positive Output Voltage Swing (VOUT+9-VOUT+12)
VS=+5V, RL= 600
Output Voltage Low (VOUT-5-VOUT-8)
VS=+5V, No Load
Output Voltage Low (VOUT-9-VOUT-12)
VS=+5V, RL= 600
Output Voltage Low (VOUT-13-VOUT-16)
VS=+5V, ISINK= 1mA
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Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH1014MW
Quad Precision Operational Amplifier.
Pre-Irradiation
Specification
MIN
MAX
Parameter
Positive Supply Current (ICC+)
2.20E-03 A
Measurement
Precision/Resolution
±5.26E-06 A
Negative Supply Current (IEE-)
-2.20E-03 A
Input Offset Voltage (VOS1-VOS4)
-3.00E-04 V
3.00E-04 V
±3.40E-06 V
Input Offset Current (IOS1-IOS4)
-1.00E-08 A
+1.00E-08 A
±3.04E-11 A
+ Input Bias Current (IB+1-IB+4)
-3.00E-08 A
3.00E-08 A
±6.02E-11 A
- Input Bias Current (IB-1-IB-4)
-3.00E-08 A
3.00E-08 A
±6.48E-11 A
Common Mode Rejection Ratio (CMRR1-CMRR4)
Power Supply Rejection Ratio (PSRR1-PSRR4)
Large Signal Voltage Gain (AVOL9-AVOL12)
Positive Output Voltage Swing (VOUT+1-VOUT+4)
±5.55E-06 A
97 dB
±4.79E-01 dB
100 dB
1.20E+03
V/mV
12.5 V
±3.23E+00 dB
Negative Output Voltage Swing (VOUT-1-VOUT-4)
±1.72E+04 V/mV
±1.90E-03 V
-12.5 V
Positive Slew Rate (SlewRate+1-SlewRate+4)
0.2 V/µs
Negative Slew Rate (SlewRate-1-SlewRate-4)
Positive Supply Current (ICC+2)
±8.71E-04 V
±1.26E-02 V/µs
-0.2 V/µs
±2.34E-02 V/µs
2.00E-03 A
±3.87E-06 A
Negative Supply Current (IEE-2)
-2.00E-03 A
±5.08E-06 A
Input Offset Voltage (VOS5-VOS8)
-4.50E-04 V
4.50E-04 V
±1.00E-06 V
Input Offset Current (IOS5-IOS8)
-1.00E-08 A
1.00E-08 A
±3.61E-11 A
+ Input Bias Current (IB+5-IB+8)
-5.00E-08 A
5.00E-08 A
±8.80E-11 A
- Input Bias Current (IB-5-IB-8)
-5.00E-08 A
5.00E-08 A
±7.13E-11 A
Positive Output Voltage Swing (VOUT+5-VOUT+8)
4.0 V
±1.17E-03 V
Positive Output Voltage Swing (VOUT+9-VOUT+12)
3.4 V
±1.38E-03 V
Output Voltage Low (VOUT-5-VOUT-8)
2.50E-02 V
±1.70E-04 V
Output Voltage Low (VOUT-9-VOUT-12)
1.00E-02 V
±2.27E-04 V
Output Voltage Low (VOUT-13-VOUT-16)
0.35 V
±1.09E-03 V
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Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
5.16.
5.17.
5.18.
5.19.
5.20.
5.21.
5.22.
5.23.
5.24.
5.25.
5.26.
5.27.
5.28.
5.29.
5.30.
5.31.
5.32.
5.33.
5.34.
5.35.
5.36.
5.37.
5.38.
Positive Supply Current @ +/-15V (A)
Negative Supply Current @ +/-15V (A)
Offset Voltage 1 @ +/-15V (V)
Offset Voltage 2 @ +/-15V (V)
Offset Voltage 3 @ +/-15V (V)
Offset Voltage 4 @ +/-15V (V)
Offset Current 1 @ +/-15V (A)
Offset Current 2 @ +/-15V (A)
Offset Current 3 @ +/-15V (A)
Offset Current 4 @ +/-15V (A)
Positive Bias Current 1 @ +/-15V (A)
Positive Bias Current 2 @ +/-15V (A)
Positive Bias Current 3 @ +/-15V (A)
Positive Bias Current 4 @ +/-15V (A)
Negative Bias Current 1 @ +/-15V (A)
Negative Bias Current 2 @ +/-15V (A)
Negative Bias Current 3 @ +/-15V (A)
Negative Bias Current 4 @ +/-15V (A)
Common Mode Rejection Ratio 1 (dB)
Common Mode Rejection Ratio 2 (dB)
Common Mode Rejection Ratio 3 (dB)
Common Mode Rejection Ratio 4 (dB)
Power Supply Rejection Ratio 1 (dB)
Power Supply Rejection Ratio 2 (dB)
Power Supply Rejection Ratio 3 (dB)
Power Supply Rejection Ratio 4 (dB)
Open Loop Gain 1 RL=10k VO=+/-10V (V/mV)
Open Loop Gain 2 RL=10k VO=+/-10V (V/mV)
Open Loop Gain 3 RL=10k VO=+/-10V (V/mV)
Open Loop Gain 4 RL=10k VO=+/-10V (V/mV)
Positive Output Voltage 1 @ +/-15V (V)
Positive Output Voltage 2 @ +/-15V (V)
Positive Output Voltage 3 @ +/-15V (V)
Positive Output Voltage 4 @ +/-15V (V)
Negative Output Voltage 1 @ +/-15V (V)
Negative Output Voltage 2 @ +/-15V (V)
Negative Output Voltage 3 @ +/-15V (V)
Negative Output Voltage 4 @ +/-15V (V)
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5.39.
5.40.
5.41.
5.42.
5.43.
5.44.
5.45.
5.46.
5.47.
5.48.
5.49.
5.50.
5.51.
5.52.
5.53.
5.54.
5.55.
5.56.
5.57.
5.58.
5.59.
5.60.
5.61.
5.62.
5.63.
5.64.
5.65.
5.66.
5.67.
5.68.
5.69.
5.70.
5.71.
5.72.
5.73.
5.74.
5.75.
5.76.
5.77.
5.78.
5.79.
5.80.
Positive Slew Rate 1 @ +/-15V (V/us)
Positive Slew Rate 2 @ +/-15V (V/us)
Positive Slew Rate 3 @ +/-15V (V/us)
Positive Slew Rate 4 @ +/-15V (V/us)
Negative Slew Rate 1 @ +/-15V (V/us)
Negative Slew Rate 2 @ +/-15V (V/us)
Negative Slew Rate 3 @ +/-15V (V/us)
Negative Slew Rate 4 @ +/-15V (V/us)
Positive Supply Current @ +5V (A)
Negative Supply Current @ +5V (A)
Offset Voltage 1 @ +5V (V)
Offset Voltage 2 @ +5V (V)
Offset Voltage 3 @ +5V (V)
Offset Voltage 4 @ +5V (V)
Offset Current 1 @ +5V (A)
Offset Current 2 @ +5V (A)
Offset Current 3 @ +5V (A)
Offset Current 4 @ +5V (A)
Positive Bias Current 1 @ +5V (A)
Positive Bias Current 2 @ +5V (A)
Positive Bias Current 3 @ +5V (A)
Positive Bias Current 4 @ +5V (A)
Negative Bias Current 1 @ +5V (A)
Negative Bias Current 2 @ +5V (A)
Negative Bias Current 3 @ +5V (A)
Negative Bias Current 4 @ +5V (A)
Positive Output Voltage 1 RL=open @ +5V (V)
Positive Output Voltage 2 RL=open @ +5V (V)
Positive Output Voltage 3 RL=open @ +5V (V)
Positive Output Voltage 4 RL=open @ +5V (V)
Positive Output Voltage 1 RL=600 @ +5V (V)
Positive Output Voltage 2 RL=600 @ +5V (V)
Positive Output Voltage 3 RL=600 @ +5V (V)
Positive Output Voltage 4 RL=600 @ +5V (V)
Output Voltage Low 1 RL=open @ +5V (V)
Output Voltage Low 2 RL=open @ +5V (V)
Output Voltage Low 3 RL=open @ +5V (V)
Output Voltage Low 4 RL=open @ +5V (V)
Output Voltage Low 1 RL=600 @ +5V (V)
Output Voltage Low 2 RL=600 @ +5V (V)
Output Voltage Low 3 RL=600 @ +5V (V)
Output Voltage Low 4 RL=600 @ +5V (V)
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5.81.
5.82.
5.83.
5.84.
Output Voltage Low 1 IL=1mA @ +5V (V)
Output Voltage Low 2 IL=1mA @ +5V (V)
Output Voltage Low 3 IL=1mA @ +5V (V)
Output Voltage Low 4 IL=1mA @ +5V (V)
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