RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1078MW Dual Operational Amplifier for Linear Technology Customer: Linear Technology (PO 49797L) RAD Job Number: 08-128 Part Type Tested: Linear Technology RH1078MW Dual Precision Op Amp Commercial Part Number: RH1078MW Traceability Information: : Fab #WP1630.1, Wafer 8, Lot #A21527, Date Code 0741A (Obtained from Linear Technology PO 49797L). See photograph of unit under test in Appendix A. Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit. Serial numbers 517, 519, 533, 534 and 535 were biased during irradiation, serial numbers 536, 537, 538, 541 and 542 were unbiased during irradiation and serial number 543 were used as the control. See Appendix B for the radiation bias connection table. External Traveler: None required Pre-Irradiation Burn-In: Burn-In performed by Linear Devices prior to receipt by RAD. TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 10, 20, 30, and 50krad(Si) TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168-hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical measurements shall be made following each anneal increment. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture, and RH1078 DUT Card. Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: All irradiations and electrical tests performed at room temperature controlled to 24°C ± 6°C per MIL STD 883. RLAT Test Result: All parts met datasheet specifications to 50krad(Si) with no substantial degradation to any measured parameter other than open loop gain. An ISO 9001:2000 Certified Company 1 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2000 Certified Company 2 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2000 Certified Company 3 RLAT Report 08-128 090621 R1.0 3.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Test Conditions The RH1078MW dual operational amplifier described in this final report was tested using two bias conditions, biased with a split 15V supply and all pins tied to ground, see Appendix A for details on biasing conditions. These devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required dose rate range of 50 to 300rad(Si)/s and was located inside a lead-aluminum box. The lead-aluminum box is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum box was determined based on TLD dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work was 62.3rad(Si)/s with a precision of ±5%. An ISO 9001:2000 Certified Company 4 RLAT Report 08-128 090621 R1.0 4.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Tested Parameters The following parameters were tested during the course of this work (note that the symbol names, e.g. AVOL3 and AVOL4 match the worksheet names in the Excel file that contains the raw data and do not necessarily refer to the channel number for this dual op-amp): 1. Positive Supply Current (ICC) 2. Negative Supply Current (IEE) 3. Input Offset Voltage (VOS1 &VOS2) 4. Input Offset Current (IOS1 & IOS2) 5. + Input Bias Current (IB+1 & IB+2) 6. - Input Bias Current (IB-1 & IB-2) 7. Common Mode Rejection Ratio (CMRR1 & CMRR2) 8. Power Supply Rejection Ratio (PSRR1 & PSRR2) 9. Large Signal Voltage Gain (AVOL 1 &AVOL2) 10. Large Signal Voltage Gain (AVOL3 &AVOL4) 11. VOUT Low (VOUTLOW1 & VOUTLOW2) 12. VOUT Low (VOUTLOW3 & VOUTLOW4) 13. VOUT Low (VOUTLOW5 & VOUTLOW6) 14. VOUT High (VOUTHIGH1 & VOUTHIGH2) 15. VOUT High (VOUTHIGH3 & VOUTHIGH4) 16. +SR (Slew Rate 1 and Slew Rate 2) 17. -SR (Slew Rate 3 and Slew Rate 4) Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the ELDRS testing: following the radiation exposure the unit shall pass the specification value and the average value for the each device must pass the specification value when the KTL limits are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot could be logged as an RLAT failure. Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a population representative of recent production runs. Smaller sample sizes may be used if agreed upon between the parties to the test. All of the selected devices shall have undergone appropriate elevated An ISO 9001:2000 Certified Company 5 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10 where the low dose rate test is considered Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test does not apply to parameters which exhibit changes that are within experimental error or whose values are below the pre-irradiation electrical specification limits at low dose rate at the specification dose. Therefore, the data in this report can be analyzed along with the high dose rate report titled “Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1078MW Dual Precision Op Amp for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. 5.0. RLAT Test Results Using the conditions stated above, the RH1078MW devices passed the RLAT test to 50krad(Si) with no significant degradation to most of the measured parameters. Where radiation induced degradation was observed the degradation was not sufficient to cause the parameter to exceed the post-irradiation specification (before and after application of the KTL statistics). Figures 5.1 through 5.62 show plots of all the measured parameters versus total ionizing dose. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. Tables 5.1 through 5.62 show the raw data, averages, standard deviation, +KTL statistics, -KTL statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of all the figures in this results section to facilitate the location of a particular parameter. An ISO 9001:2000 Certified Company 6 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the specification even after application of the KTL statistics (with certain exceptions, as noted below). The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained under control during the course of the testing. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. The parameters measured in this report where the preirradiation KTL values are out of specification include Input Offset Voltage and Power Supply Rejection Ratio. In both cases these parameters were in specification at the 50krad(Si) read point due to the “loosening” of the post-irradiation specifications relative to the standard deviation of the sample population and/or our measurement precision. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 7 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @+5V (A) 1.60E-04 1.40E-04 1.20E-04 1.00E-04 8.00E-05 6.00E-05 4.00E-05 2.00E-05 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.1. Plot of Positive Supply Current @+5V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 8 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.1. Raw data for Positive Supply Current @+5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @+5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.80E-05 9.40E-05 8.90E-05 8.70E-05 9.00E-05 9.70E-05 9.70E-05 9.60E-05 1.01E-04 9.20E-05 9.10E-05 10 8.60E-05 9.20E-05 8.50E-05 8.40E-05 8.90E-05 9.40E-05 9.30E-05 9.40E-05 9.80E-05 9.10E-05 9.10E-05 20 8.40E-05 8.90E-05 8.30E-05 8.20E-05 8.60E-05 9.10E-05 9.00E-05 9.10E-05 9.50E-05 8.70E-05 9.10E-05 30 8.10E-05 8.60E-05 8.00E-05 7.90E-05 8.40E-05 8.80E-05 8.80E-05 8.80E-05 9.10E-05 8.50E-05 9.20E-05 50 7.60E-05 8.10E-05 7.60E-05 7.50E-05 7.90E-05 8.30E-05 8.30E-05 8.20E-05 8.20E-05 8.00E-05 9.20E-05 60 7.70E-05 8.00E-05 7.50E-05 7.50E-05 7.80E-05 8.50E-05 8.40E-05 8.40E-05 8.50E-05 8.10E-05 9.30E-05 70 7.60E-05 8.30E-05 7.50E-05 7.50E-05 7.80E-05 8.70E-05 8.70E-05 8.60E-05 9.00E-05 8.40E-05 9.10E-05 8.96E-05 2.70E-06 9.70E-05 8.22E-05 8.72E-05 3.27E-06 9.62E-05 7.82E-05 8.48E-05 2.77E-06 9.24E-05 7.72E-05 8.20E-05 2.92E-06 9.00E-05 7.40E-05 7.74E-05 2.51E-06 8.43E-05 7.05E-05 7.70E-05 2.12E-06 8.28E-05 7.12E-05 7.74E-05 3.36E-06 8.66E-05 6.82E-05 9.66E-05 3.21E-06 1.05E-04 8.78E-05 1.50E-04 PASS 9.40E-05 2.55E-06 1.01E-04 8.70E-05 1.50E-04 PASS 9.08E-05 2.86E-06 9.87E-05 8.29E-05 1.50E-04 PASS 8.80E-05 2.12E-06 9.38E-05 8.22E-05 1.50E-04 PASS 8.20E-05 1.22E-06 8.54E-05 7.86E-05 1.50E-04 PASS 8.38E-05 1.64E-06 8.83E-05 7.93E-05 1.50E-04 PASS 8.68E-05 2.17E-06 9.27E-05 8.09E-05 1.50E-04 PASS An ISO 9001:2000 Certified Company 9 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @+5V (A) 0.00E+00 -2.00E-05 -4.00E-05 -6.00E-05 -8.00E-05 -1.00E-04 -1.20E-04 -1.40E-04 -1.60E-04 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current @+5V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 10 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.2. Raw data for Negative Supply Current @+5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @+5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -8.50E-05 -9.10E-05 -8.50E-05 -8.40E-05 -8.80E-05 -9.30E-05 -9.30E-05 -9.30E-05 -9.80E-05 -8.90E-05 -8.90E-05 10 -8.40E-05 -8.90E-05 -8.30E-05 -8.20E-05 -8.60E-05 -9.20E-05 -9.10E-05 -9.20E-05 -9.50E-05 -8.80E-05 -8.90E-05 20 -8.10E-05 -8.70E-05 -8.10E-05 -7.90E-05 -8.30E-05 -8.80E-05 -8.80E-05 -8.80E-05 -9.20E-05 -8.50E-05 -8.80E-05 30 -7.80E-05 -8.30E-05 -7.80E-05 -7.70E-05 -8.00E-05 -8.60E-05 -8.60E-05 -8.50E-05 -8.80E-05 -8.20E-05 -8.90E-05 50 -7.30E-05 -7.70E-05 -7.30E-05 -7.20E-05 -7.60E-05 -7.90E-05 -8.00E-05 -7.90E-05 -8.00E-05 -7.60E-05 -9.00E-05 60 -8.00E-05 -7.80E-05 -7.50E-05 -7.60E-05 -7.50E-05 -8.10E-05 -8.10E-05 -8.10E-05 -8.10E-05 -7.70E-05 -8.90E-05 70 -7.20E-05 -8.10E-05 -7.20E-05 -7.20E-05 -7.50E-05 -8.40E-05 -8.40E-05 -8.30E-05 -8.60E-05 -8.10E-05 -8.80E-05 -8.66E-05 2.88E-06 -7.87E-05 -9.45E-05 -8.48E-05 2.77E-06 -7.72E-05 -9.24E-05 -8.22E-05 3.03E-06 -7.39E-05 -9.05E-05 -7.92E-05 2.39E-06 -7.27E-05 -8.57E-05 -7.42E-05 2.17E-06 -6.83E-05 -8.01E-05 -7.68E-05 2.17E-06 -7.09E-05 -8.27E-05 -7.44E-05 3.91E-06 -6.37E-05 -8.51E-05 -9.32E-05 3.19E-06 -8.44E-05 -1.02E-04 -1.50E-04 PASS -9.16E-05 2.51E-06 -8.47E-05 -9.85E-05 -1.50E-04 PASS -8.82E-05 2.49E-06 -8.14E-05 -9.50E-05 -1.50E-04 PASS -8.54E-05 2.19E-06 -7.94E-05 -9.14E-05 -1.50E-04 PASS -7.88E-05 1.64E-06 -7.43E-05 -8.33E-05 -1.50E-04 PASS -8.02E-05 1.79E-06 -7.53E-05 -8.51E-05 -1.50E-04 PASS -8.36E-05 1.82E-06 -7.86E-05 -8.86E-05 -1.50E-04 PASS An ISO 9001:2000 Certified Company 11 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 1 @ +5V (V) 3.00E-04 2.00E-04 1.00E-04 0.00E+00 -1.00E-04 -2.00E-04 -3.00E-04 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.3. Plot of Input Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 12 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.3. Raw data for Input Offset Voltage 1 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 @ +5V (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.53E-06 -3.29E-05 -2.75E-05 -6.00E-06 1.31E-05 3.16E-05 -7.69E-06 2.47E-05 5.11E-06 -2.09E-05 1.45E-05 10 -1.20E-05 -5.25E-05 -5.16E-05 -2.33E-05 -1.47E-05 1.90E-05 -2.29E-05 1.17E-05 -1.11E-05 -3.41E-05 1.56E-05 20 -8.22E-06 -5.71E-05 -5.75E-05 -2.31E-05 -1.21E-05 1.81E-05 -2.84E-05 4.11E-06 -2.55E-05 -4.21E-05 1.74E-05 30 1.24E-07 -4.69E-05 -4.93E-05 -1.87E-05 -1.05E-05 5.07E-06 -3.65E-05 5.07E-06 -4.52E-05 -4.99E-05 1.32E-05 50 4.47E-06 -4.22E-05 -5.86E-05 -1.84E-05 -1.70E-05 5.07E-06 -4.32E-05 -2.05E-06 -6.67E-05 -5.72E-05 1.23E-05 60 3.03E-05 -2.28E-05 -3.13E-05 7.23E-06 1.00E-05 1.21E-05 -3.25E-05 4.21E-06 -4.82E-05 -4.81E-05 1.43E-05 70 1.28E-04 -1.91E-05 -5.20E-06 9.90E-06 4.34E-05 2.17E-05 -9.42E-06 2.61E-05 -7.25E-06 -3.44E-05 1.53E-05 -9.17E-06 2.05E-05 4.71E-05 -6.54E-05 -3.08E-05 1.98E-05 2.36E-05 -8.52E-05 -3.16E-05 2.41E-05 3.45E-05 -9.77E-05 -2.50E-05 2.21E-05 3.55E-05 -8.55E-05 -2.63E-05 2.44E-05 4.07E-05 -9.33E-05 -1.32E-06 2.53E-05 6.81E-05 -7.07E-05 3.13E-05 5.86E-05 1.92E-04 -1.29E-04 6.56E-06 2.19E-05 6.65E-05 -5.34E-05 -1.20E-04 PASS 1.20E-04 PASS -7.49E-06 2.25E-05 5.42E-05 -6.92E-05 -1.20E-04 PASS 1.20E-04 PASS -1.48E-05 2.49E-05 5.36E-05 -8.31E-05 -1.20E-04 PASS 1.20E-04 PASS -2.43E-05 2.72E-05 5.04E-05 -9.89E-05 -1.75E-04 PASS 1.75E-04 PASS -3.28E-05 3.25E-05 5.64E-05 -1.22E-04 -2.50E-04 PASS 2.50E-04 PASS -2.25E-05 2.88E-05 5.65E-05 -1.02E-04 -2.50E-04 PASS 2.50E-04 PASS -6.54E-07 2.49E-05 6.76E-05 -6.89E-05 -2.50E-04 PASS 2.50E-04 PASS An ISO 9001:2000 Certified Company 13 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 2 @ +5V (V) 3.00E-04 2.00E-04 1.00E-04 0.00E+00 -1.00E-04 -2.00E-04 -3.00E-04 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.4. Plot of Input Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 14 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.4. Raw data for Input Offset Voltage 2 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 2 @ +5V (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -5.99E-05 -6.68E-05 -2.74E-06 4.45E-05 3.42E-06 -4.46E-07 -1.17E-06 -9.26E-06 7.77E-06 3.59E-05 -8.42E-06 10 -8.10E-05 -8.72E-05 -2.73E-05 1.59E-05 -2.28E-05 -1.59E-05 -1.99E-05 -2.23E-05 -2.71E-05 1.82E-05 -1.07E-05 20 -7.65E-05 -8.41E-05 -2.34E-05 1.92E-05 -2.62E-05 -2.49E-05 -2.89E-05 -2.81E-05 -5.02E-05 8.94E-06 -1.28E-05 30 -7.51E-05 -8.70E-05 -2.09E-05 2.31E-05 -2.02E-05 -2.97E-05 -3.63E-05 -3.41E-05 -7.70E-05 -7.22E-07 -1.12E-05 50 -5.92E-05 -7.65E-05 -5.41E-05 2.89E-05 -2.10E-05 -3.66E-05 -4.56E-05 -3.92E-05 1.35E-04 -9.78E-06 -1.38E-05 60 -4.58E-05 -6.21E-05 -2.09E-05 4.25E-05 4.21E-06 -2.20E-05 -3.71E-05 -3.36E-05 1.04E-04 -7.42E-07 -1.56E-05 70 1.29E-04 1.96E-05 7.24E-06 4.21E-05 9.30E-06 -1.20E-05 -2.74E-05 -3.21E-05 -4.88E-05 1.28E-05 -1.55E-05 -1.63E-05 4.67E-05 1.12E-04 -1.44E-04 -4.05E-05 4.33E-05 7.82E-05 -1.59E-04 -3.82E-05 4.25E-05 7.83E-05 -1.55E-04 -3.60E-05 4.50E-05 8.73E-05 -1.59E-04 -3.64E-05 4.16E-05 7.78E-05 -1.51E-04 -1.64E-05 4.14E-05 9.71E-05 -1.30E-04 4.15E-05 5.10E-05 1.81E-04 -9.82E-05 6.56E-06 1.75E-05 5.45E-05 -4.14E-05 -1.20E-04 FAIL 1.20E-04 PASS -1.34E-05 1.81E-05 3.63E-05 -6.31E-05 -1.20E-04 FAIL 1.20E-04 PASS -2.46E-05 2.13E-05 3.37E-05 -8.30E-05 -1.20E-04 FAIL 1.20E-04 PASS -3.56E-05 2.73E-05 3.92E-05 -1.10E-04 -1.75E-04 PASS 1.75E-04 PASS 7.02E-07 7.62E-05 2.10E-04 -2.08E-04 -2.50E-04 PASS 2.50E-04 PASS 2.19E-06 5.88E-05 1.64E-04 -1.59E-04 -2.50E-04 PASS 2.50E-04 PASS -2.15E-05 2.32E-05 4.22E-05 -8.52E-05 -2.50E-04 PASS 2.50E-04 PASS An ISO 9001:2000 Certified Company 15 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 1 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.5. Plot of Input Offset Current 1 @ +5V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 16 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.5. Raw data for Input Offset Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 1 @ +5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -7.00E-11 -1.40E-10 0.00E+00 -1.30E-10 -4.00E-11 -7.00E-11 -1.90E-10 -4.00E-11 -7.00E-11 5.00E-11 -2.10E-10 10 -6.00E-11 -6.00E-11 4.00E-11 -1.00E-10 -2.00E-11 -1.00E-10 -1.20E-10 -7.00E-11 -1.00E-10 -5.00E-11 -2.00E-10 20 -6.00E-11 -1.00E-10 -3.00E-11 -1.10E-10 -3.00E-11 -1.50E-10 -1.40E-10 -6.00E-11 -8.00E-11 -5.00E-11 -1.80E-10 30 -5.00E-11 -3.00E-11 -1.00E-10 -1.40E-10 1.50E-10 -1.60E-10 -7.00E-11 -2.00E-11 -1.30E-10 -4.00E-11 -2.00E-10 50 -4.00E-11 -1.20E-10 -3.90E-10 -2.10E-10 -2.40E-10 -3.10E-10 -1.10E-10 -1.00E-10 -1.20E-10 -3.00E-11 -2.10E-10 60 -5.00E-11 -1.50E-10 -7.40E-10 -4.00E-11 -3.70E-10 -2.20E-10 -4.00E-11 -1.90E-10 -1.60E-10 1.10E-10 -1.90E-10 70 4.55E-09 1.20E-10 4.30E-10 -2.60E-10 6.60E-10 -1.20E-10 -6.00E-11 -2.00E-11 -2.00E-10 9.00E-11 -2.10E-10 -7.60E-11 5.94E-11 8.69E-11 -2.39E-10 -4.00E-11 5.29E-11 1.05E-10 -1.85E-10 -6.60E-11 3.78E-11 3.77E-11 -1.70E-10 -3.40E-11 1.11E-10 2.72E-10 -3.40E-10 -2.00E-10 1.32E-10 1.62E-10 -5.62E-10 -2.70E-10 2.94E-10 5.37E-10 -1.08E-09 1.10E-09 1.96E-09 6.47E-09 -4.27E-09 -6.40E-11 8.59E-11 1.72E-10 -3.00E-10 -8.00E-10 PASS 8.00E-10 PASS -8.80E-11 2.77E-11 -1.19E-11 -1.64E-10 -2.00E-09 PASS 2.00E-09 PASS -9.60E-11 4.62E-11 3.05E-11 -2.23E-10 -2.00E-09 PASS 2.00E-09 PASS -8.40E-11 5.94E-11 7.89E-11 -2.47E-10 -8.00E-09 PASS 8.00E-09 PASS -1.34E-10 1.05E-10 1.53E-10 -4.21E-10 -1.30E-08 PASS 1.30E-08 PASS -1.00E-10 1.36E-10 2.72E-10 -4.72E-10 -1.30E-08 PASS 1.30E-08 PASS -6.20E-11 1.09E-10 2.36E-10 -3.60E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2000 Certified Company 17 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 2 @ +5V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.6. Plot of Input Offset Current 2 @ +5V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 18 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.6. Raw data for Input Offset Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 @ +5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.00E-11 -5.00E-11 -5.00E-11 -1.80E-10 -9.00E-11 -1.30E-10 -4.00E-11 -4.00E-11 -1.60E-10 -1.10E-10 -4.00E-11 10 9.00E-11 -5.00E-11 -7.00E-11 -1.60E-10 -1.00E-10 -6.00E-11 -1.00E-10 -4.00E-11 -2.00E-10 -3.00E-11 -7.00E-11 20 4.00E-11 -1.00E-10 -1.10E-10 -1.90E-10 -8.00E-11 -9.00E-11 2.00E-11 1.00E-10 -1.50E-10 -4.00E-11 -4.00E-11 30 0.00E+00 2.00E-11 -5.00E-11 -2.60E-10 -5.00E-11 -1.00E-11 -3.00E-11 1.10E-10 -2.50E-10 -8.00E-11 -5.00E-11 50 -2.00E-11 -3.00E-11 -1.40E-10 -3.50E-10 -3.60E-10 -5.00E-11 -6.00E-11 2.40E-10 -3.00E-10 -1.50E-10 -4.00E-11 60 6.00E-11 5.00E-11 -1.20E-10 -2.20E-10 -6.00E-11 1.20E-10 9.00E-11 4.90E-10 9.00E-11 1.50E-10 -4.00E-11 70 6.00E-09 4.72E-09 -4.90E-10 -3.80E-10 -3.20E-10 1.00E-11 -1.10E-10 1.30E-10 -1.50E-10 -7.00E-11 -6.00E-11 -6.20E-11 8.64E-11 1.75E-10 -2.99E-10 -5.80E-11 9.26E-11 1.96E-10 -3.12E-10 -8.80E-11 8.29E-11 1.39E-10 -3.15E-10 -6.80E-11 1.12E-10 2.38E-10 -3.74E-10 -1.80E-10 1.67E-10 2.77E-10 -6.37E-10 -5.80E-11 1.18E-10 2.66E-10 -3.82E-10 1.91E-09 3.19E-09 1.06E-08 -6.83E-09 -9.60E-11 5.41E-11 5.24E-11 -2.44E-10 -8.00E-10 PASS 8.00E-10 PASS -8.60E-11 6.91E-11 1.04E-10 -2.76E-10 -2.00E-09 PASS 2.00E-09 PASS -3.20E-11 9.68E-11 2.33E-10 -2.97E-10 -2.00E-09 PASS 2.00E-09 PASS -5.20E-11 1.31E-10 3.07E-10 -4.11E-10 -8.00E-09 PASS 8.00E-09 PASS -6.40E-11 1.97E-10 4.77E-10 -6.05E-10 -1.30E-08 PASS 1.30E-08 PASS 1.88E-10 1.71E-10 6.56E-10 -2.80E-10 -1.30E-08 PASS 1.30E-08 PASS -3.80E-11 1.11E-10 2.66E-10 -3.42E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2000 Certified Company 19 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 1 @ +5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.7. Plot of Positive Input Bias Current 1 @ +5V (A) versus total dose. The data show an increase with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 20 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.7. Raw data for Positive Input Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 1 @ +5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.48E-09 8.69E-09 8.90E-09 8.61E-09 8.34E-09 8.19E-09 8.49E-09 8.20E-09 8.04E-09 8.68E-09 8.71E-09 10 9.62E-09 9.92E-09 1.02E-08 9.82E-09 9.58E-09 9.47E-09 9.74E-09 9.50E-09 9.35E-09 1.00E-08 8.77E-09 20 1.14E-08 1.17E-08 1.19E-08 1.15E-08 1.14E-08 1.14E-08 1.16E-08 1.14E-08 1.13E-08 1.19E-08 8.79E-09 30 1.32E-08 1.37E-08 1.38E-08 1.33E-08 1.33E-08 1.31E-08 1.36E-08 1.32E-08 1.30E-08 1.40E-08 8.81E-09 50 1.70E-08 1.75E-08 1.76E-08 1.73E-08 1.70E-08 1.68E-08 1.74E-08 1.73E-08 1.69E-08 1.80E-08 8.68E-09 60 1.91E-08 1.94E-08 1.95E-08 1.91E-08 1.88E-08 1.72E-08 1.77E-08 1.75E-08 1.72E-08 1.81E-08 8.79E-09 70 2.14E-08 1.89E-08 2.12E-08 2.06E-08 2.01E-08 1.58E-08 1.61E-08 1.61E-08 1.57E-08 1.64E-08 8.74E-09 8.60E-09 2.12E-10 9.19E-09 8.02E-09 9.83E-09 2.62E-10 1.06E-08 9.12E-09 1.16E-08 2.03E-10 1.21E-08 1.10E-08 1.35E-08 2.39E-10 1.41E-08 1.28E-08 1.73E-08 2.50E-10 1.79E-08 1.66E-08 1.92E-08 2.57E-10 1.99E-08 1.85E-08 2.04E-08 9.81E-10 2.31E-08 1.77E-08 8.32E-09 2.59E-10 9.03E-09 7.61E-09 -1.50E-08 PASS 1.50E-08 PASS 9.62E-09 2.70E-10 1.04E-08 8.88E-09 -2.00E-08 PASS 2.00E-08 PASS 1.15E-08 2.57E-10 1.22E-08 1.08E-08 -2.00E-08 PASS 2.00E-08 PASS 1.34E-08 3.88E-10 1.44E-08 1.23E-08 -4.00E-08 PASS 4.00E-08 PASS 1.73E-08 4.58E-10 1.85E-08 1.60E-08 -8.00E-08 PASS 8.00E-08 PASS 1.75E-08 3.55E-10 1.85E-08 1.66E-08 -8.00E-08 PASS 8.00E-08 PASS 1.60E-08 2.57E-10 1.67E-08 1.53E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 21 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 2 @ +5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.8. Plot of Positive Input Bias Current 2 @ +5V (A) versus total dose. The data show an increase with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 22 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.8. Raw data for Positive Input Bias Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 2 @ +5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.61E-09 8.68E-09 8.76E-09 8.55E-09 8.25E-09 8.39E-09 8.61E-09 8.26E-09 8.06E-09 8.67E-09 8.81E-09 10 9.75E-09 9.97E-09 1.01E-08 9.76E-09 9.50E-09 9.80E-09 9.88E-09 9.62E-09 9.50E-09 1.01E-08 8.91E-09 20 1.16E-08 1.18E-08 1.17E-08 1.15E-08 1.13E-08 1.18E-08 1.18E-08 1.17E-08 1.15E-08 1.21E-08 8.89E-09 30 1.35E-08 1.37E-08 1.37E-08 1.34E-08 1.32E-08 1.36E-08 1.36E-08 1.35E-08 1.34E-08 1.41E-08 8.89E-09 50 1.73E-08 1.75E-08 1.76E-08 1.73E-08 1.68E-08 1.74E-08 1.74E-08 1.76E-08 1.78E-08 1.80E-08 8.94E-09 60 1.93E-08 1.95E-08 1.95E-08 1.92E-08 1.87E-08 1.81E-08 1.80E-08 1.80E-08 1.85E-08 1.84E-08 8.95E-09 70 2.21E-08 2.07E-08 2.11E-08 2.07E-08 1.96E-08 1.63E-08 1.62E-08 1.62E-08 1.67E-08 1.65E-08 8.83E-09 8.57E-09 1.95E-10 9.11E-09 8.03E-09 9.82E-09 2.36E-10 1.05E-08 9.17E-09 1.16E-08 1.84E-10 1.21E-08 1.11E-08 1.35E-08 2.19E-10 1.41E-08 1.29E-08 1.73E-08 3.12E-10 1.82E-08 1.65E-08 1.92E-08 3.28E-10 2.01E-08 1.83E-08 2.08E-08 9.00E-10 2.33E-08 1.84E-08 8.40E-09 2.51E-10 9.09E-09 7.71E-09 -1.50E-08 PASS 1.50E-08 PASS 9.78E-09 2.40E-10 1.04E-08 9.13E-09 -2.00E-08 PASS 2.00E-08 PASS 1.18E-08 2.10E-10 1.23E-08 1.12E-08 -2.00E-08 PASS 2.00E-08 PASS 1.36E-08 2.54E-10 1.43E-08 1.29E-08 -4.00E-08 PASS 4.00E-08 PASS 1.77E-08 2.52E-10 1.84E-08 1.70E-08 -8.00E-08 PASS 8.00E-08 PASS 1.82E-08 2.34E-10 1.88E-08 1.76E-08 -8.00E-08 PASS 8.00E-08 PASS 1.64E-08 2.20E-10 1.70E-08 1.58E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 23 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 1 @ +5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.9. Plot of Negative Input Bias Current 1 @ +5V (A) versus total dose. The data show an increase with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 24 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.9. Raw data for Negative Input Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 1 @ +5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.56E-09 8.82E-09 8.90E-09 8.76E-09 8.37E-09 8.28E-09 8.65E-09 8.30E-09 8.15E-09 8.65E-09 8.92E-09 10 9.70E-09 9.99E-09 1.03E-08 9.92E-09 9.64E-09 9.64E-09 9.96E-09 9.58E-09 9.50E-09 1.02E-08 9.01E-09 20 1.15E-08 1.19E-08 1.19E-08 1.16E-08 1.15E-08 1.15E-08 1.18E-08 1.15E-08 1.13E-08 1.20E-08 8.99E-09 30 1.34E-08 1.38E-08 1.39E-08 1.35E-08 1.32E-08 1.33E-08 1.37E-08 1.32E-08 1.32E-08 1.41E-08 8.99E-09 50 1.72E-08 1.76E-08 1.80E-08 1.75E-08 1.74E-08 1.71E-08 1.75E-08 1.74E-08 1.71E-08 1.80E-08 9.02E-09 60 1.91E-08 1.96E-08 2.02E-08 1.92E-08 1.93E-08 1.75E-08 1.78E-08 1.76E-08 1.74E-08 1.80E-08 8.98E-09 70 1.69E-08 1.88E-08 2.08E-08 2.09E-08 1.95E-08 1.60E-08 1.61E-08 1.61E-08 1.59E-08 1.63E-08 8.97E-09 8.68E-09 2.15E-10 9.27E-09 8.09E-09 9.90E-09 2.51E-10 1.06E-08 9.21E-09 1.17E-08 2.21E-10 1.23E-08 1.11E-08 1.35E-08 2.93E-10 1.43E-08 1.27E-08 1.75E-08 2.90E-10 1.83E-08 1.67E-08 1.95E-08 4.68E-10 2.08E-08 1.82E-08 1.94E-08 1.65E-09 2.39E-08 1.49E-08 8.41E-09 2.30E-10 9.04E-09 7.78E-09 -1.50E-08 PASS 1.50E-08 PASS 9.77E-09 2.77E-10 1.05E-08 9.01E-09 -2.00E-08 PASS 2.00E-08 PASS 1.16E-08 2.70E-10 1.24E-08 1.09E-08 -2.00E-08 PASS 2.00E-08 PASS 1.35E-08 3.66E-10 1.45E-08 1.25E-08 -4.00E-08 PASS 4.00E-08 PASS 1.74E-08 3.85E-10 1.85E-08 1.64E-08 -8.00E-08 PASS 8.00E-08 PASS 1.77E-08 2.62E-10 1.84E-08 1.69E-08 -8.00E-08 PASS 8.00E-08 PASS 1.61E-08 1.65E-10 1.65E-08 1.56E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 25 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 2 @+5V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.10. Plot of Negative Input Bias Current 2 @+5V (A) versus total dose. The data show an increase with radiation, however not sufficient for the parameter to exceed its post-irradiation test limits. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 26 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.10. Raw data for Negative Input Bias Current 2 @+5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 2 @+5V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.54E-09 8.77E-09 8.82E-09 8.75E-09 8.34E-09 8.52E-09 8.64E-09 8.31E-09 8.24E-09 8.80E-09 8.91E-09 10 9.69E-09 1.01E-08 1.02E-08 9.93E-09 9.59E-09 9.86E-09 1.00E-08 9.65E-09 9.73E-09 1.02E-08 9.00E-09 20 1.15E-08 1.19E-08 1.19E-08 1.17E-08 1.15E-08 1.19E-08 1.18E-08 1.16E-08 1.17E-08 1.21E-08 8.99E-09 30 1.35E-08 1.38E-08 1.38E-08 1.37E-08 1.33E-08 1.37E-08 1.37E-08 1.33E-08 1.37E-08 1.42E-08 8.96E-09 50 1.73E-08 1.76E-08 1.78E-08 1.77E-08 1.73E-08 1.76E-08 1.75E-08 1.74E-08 1.81E-08 1.82E-08 8.97E-09 60 1.93E-08 1.95E-08 1.96E-08 1.95E-08 1.89E-08 1.80E-08 1.79E-08 1.77E-08 1.84E-08 1.84E-08 9.00E-09 70 1.61E-08 1.60E-08 2.16E-08 2.11E-08 2.00E-08 1.63E-08 1.64E-08 1.61E-08 1.69E-08 1.66E-08 8.92E-09 8.64E-09 2.01E-10 9.19E-09 8.09E-09 9.90E-09 2.57E-10 1.06E-08 9.19E-09 1.17E-08 2.10E-10 1.23E-08 1.11E-08 1.36E-08 2.24E-10 1.42E-08 1.30E-08 1.76E-08 2.37E-10 1.82E-08 1.69E-08 1.93E-08 2.97E-10 2.02E-08 1.85E-08 1.90E-08 2.70E-09 2.64E-08 1.16E-08 8.50E-09 2.31E-10 9.14E-09 7.87E-09 -1.50E-08 PASS 1.50E-08 PASS 9.89E-09 2.17E-10 1.05E-08 9.29E-09 -2.00E-08 PASS 2.00E-08 PASS 1.18E-08 1.90E-10 1.23E-08 1.13E-08 -2.00E-08 PASS 2.00E-08 PASS 1.37E-08 2.99E-10 1.45E-08 1.29E-08 -4.00E-08 PASS 4.00E-08 PASS 1.78E-08 3.72E-10 1.88E-08 1.67E-08 -8.00E-08 PASS 8.00E-08 PASS 1.81E-08 3.15E-10 1.89E-08 1.72E-08 -8.00E-08 PASS 8.00E-08 PASS 1.65E-08 2.99E-10 1.73E-08 1.56E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 27 Common Mode Rejection Ratio 1 @ +5V (dB) RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.11. Plot of Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 28 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.11. Raw data for Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 @ +5V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.03E+02 1.08E+02 1.03E+02 1.04E+02 1.08E+02 1.10E+02 1.05E+02 1.06E+02 1.04E+02 1.11E+02 1.04E+02 10 1.02E+02 1.07E+02 1.00E+02 1.03E+02 1.04E+02 1.07E+02 1.04E+02 1.03E+02 1.03E+02 1.05E+02 1.03E+02 20 1.02E+02 1.04E+02 1.01E+02 1.01E+02 1.05E+02 1.08E+02 1.02E+02 1.04E+02 1.01E+02 1.04E+02 1.08E+02 30 1.02E+02 1.04E+02 1.01E+02 1.04E+02 1.04E+02 1.04E+02 1.03E+02 1.04E+02 1.00E+02 1.07E+02 1.05E+02 50 1.00E+02 1.03E+02 1.01E+02 1.03E+02 1.04E+02 1.06E+02 1.03E+02 1.01E+02 9.81E+01 1.02E+02 1.05E+02 60 1.05E+02 1.05E+02 1.02E+02 1.03E+02 1.08E+02 1.07E+02 1.02E+02 1.04E+02 1.00E+02 1.05E+02 1.06E+02 70 1.04E+02 1.07E+02 1.00E+02 1.05E+02 1.02E+02 1.10E+02 1.04E+02 1.06E+02 1.01E+02 1.05E+02 1.04E+02 1.05E+02 2.39E+00 1.12E+02 9.86E+01 1.03E+02 2.71E+00 1.11E+02 9.57E+01 1.03E+02 1.97E+00 1.08E+02 9.72E+01 1.03E+02 1.44E+00 1.07E+02 9.89E+01 1.02E+02 1.42E+00 1.06E+02 9.83E+01 1.04E+02 2.12E+00 1.10E+02 9.87E+01 1.03E+02 2.54E+00 1.10E+02 9.65E+01 1.07E+02 3.29E+00 1.16E+02 9.80E+01 9.40E+01 PASS 1.04E+02 1.68E+00 1.09E+02 9.97E+01 9.10E+01 PASS 1.04E+02 2.74E+00 1.11E+02 9.63E+01 9.10E+01 PASS 1.03E+02 2.38E+00 1.10E+02 9.69E+01 8.90E+01 PASS 1.02E+02 2.88E+00 1.10E+02 9.42E+01 8.70E+01 PASS 1.03E+02 2.52E+00 1.10E+02 9.65E+01 8.70E+01 PASS 1.05E+02 3.39E+00 1.14E+02 9.58E+01 8.70E+01 PASS An ISO 9001:2000 Certified Company 29 Common Mode Rejection Ratio 2 @ +5V (dB) RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.12. Plot of Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 30 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.12. Raw data for Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 @ +5V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.05E+02 1.14E+02 1.05E+02 1.09E+02 1.15E+02 1.05E+02 1.05E+02 1.03E+02 1.04E+02 1.06E+02 1.05E+02 10 1.01E+02 1.08E+02 1.03E+02 1.05E+02 1.13E+02 1.04E+02 1.04E+02 1.02E+02 1.04E+02 1.05E+02 1.04E+02 20 1.02E+02 1.07E+02 1.02E+02 1.05E+02 1.11E+02 1.03E+02 1.03E+02 1.02E+02 1.01E+02 1.03E+02 1.06E+02 30 1.02E+02 1.09E+02 1.02E+02 1.04E+02 1.11E+02 1.01E+02 1.02E+02 1.01E+02 1.01E+02 1.04E+02 1.06E+02 50 1.00E+02 1.05E+02 1.02E+02 1.05E+02 1.12E+02 1.00E+02 1.02E+02 9.99E+01 9.81E+01 1.01E+02 1.04E+02 60 1.03E+02 1.06E+02 1.04E+02 1.08E+02 1.15E+02 1.02E+02 1.02E+02 1.01E+02 1.00E+02 1.02E+02 1.08E+02 70 1.04E+02 1.09E+02 1.02E+02 1.09E+02 1.13E+02 1.02E+02 1.03E+02 1.03E+02 1.03E+02 1.04E+02 1.04E+02 1.09E+02 4.75E+00 1.22E+02 9.64E+01 1.06E+02 4.53E+00 1.19E+02 9.38E+01 1.06E+02 3.89E+00 1.16E+02 9.49E+01 1.06E+02 4.01E+00 1.17E+02 9.46E+01 1.05E+02 4.43E+00 1.17E+02 9.25E+01 1.07E+02 4.78E+00 1.20E+02 9.40E+01 1.07E+02 4.43E+00 1.19E+02 9.50E+01 1.05E+02 1.19E+00 1.08E+02 1.02E+02 9.40E+01 PASS 1.04E+02 9.69E-01 1.07E+02 1.01E+02 9.10E+01 PASS 1.02E+02 7.03E-01 1.04E+02 1.01E+02 9.10E+01 PASS 1.02E+02 1.21E+00 1.05E+02 9.85E+01 8.90E+01 PASS 1.00E+02 1.59E+00 1.05E+02 9.60E+01 8.70E+01 PASS 1.01E+02 8.33E-01 1.04E+02 9.92E+01 8.70E+01 PASS 1.03E+02 4.29E-01 1.04E+02 1.02E+02 8.70E+01 PASS An ISO 9001:2000 Certified Company 31 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 1 @ +5V (dB) 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.13. Plot of Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 32 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.13. Raw data for Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 1 @ +5V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.18E+02 1.20E+02 1.26E+02 1.20E+02 1.18E+02 1.27E+02 1.24E+02 1.22E+02 1.29E+02 1.22E+02 1.22E+02 10 1.23E+02 1.17E+02 1.28E+02 1.21E+02 1.22E+02 1.35E+02 1.25E+02 1.18E+02 1.35E+02 1.22E+02 1.28E+02 20 1.23E+02 1.21E+02 1.20E+02 1.23E+02 1.18E+02 1.30E+02 1.46E+02 1.25E+02 1.34E+02 1.25E+02 1.17E+02 30 1.17E+02 1.17E+02 1.21E+02 1.16E+02 1.21E+02 1.38E+02 1.32E+02 1.43E+02 1.34E+02 1.19E+02 1.21E+02 50 1.16E+02 1.15E+02 1.20E+02 1.14E+02 1.15E+02 1.24E+02 1.22E+02 1.22E+02 1.39E+02 1.22E+02 1.27E+02 60 1.14E+02 1.16E+02 1.19E+02 1.17E+02 1.15E+02 1.30E+02 1.44E+02 1.49E+02 1.38E+02 1.25E+02 1.19E+02 70 1.12E+02 1.13E+02 1.22E+02 1.13E+02 1.18E+02 1.32E+02 1.23E+02 1.37E+02 1.30E+02 1.18E+02 1.27E+02 1.20E+02 3.27E+00 1.29E+02 1.11E+02 1.22E+02 4.16E+00 1.34E+02 1.11E+02 1.21E+02 2.29E+00 1.27E+02 1.15E+02 1.18E+02 2.32E+00 1.25E+02 1.12E+02 1.16E+02 2.43E+00 1.23E+02 1.10E+02 1.16E+02 1.69E+00 1.21E+02 1.12E+02 1.15E+02 4.33E+00 1.27E+02 1.04E+02 1.25E+02 3.37E+00 1.34E+02 1.15E+02 1.00E+02 PASS 1.27E+02 7.76E+00 1.49E+02 1.06E+02 1.00E+02 PASS 1.32E+02 8.96E+00 1.56E+02 1.07E+02 1.00E+02 PASS 1.33E+02 8.79E+00 1.57E+02 1.09E+02 1.00E+02 PASS 1.26E+02 7.16E+00 1.46E+02 1.06E+02 9.80E+01 PASS 1.38E+02 9.78E+00 1.64E+02 1.11E+02 9.80E+01 PASS 1.28E+02 7.34E+00 1.48E+02 1.08E+02 9.80E+01 PASS An ISO 9001:2000 Certified Company 33 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 2 @ +5V (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.14. Plot of Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 34 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.14. Raw data for Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 2 @ +5V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.15E+02 1.12E+02 1.15E+02 1.18E+02 1.25E+02 1.33E+02 1.43E+02 1.23E+02 1.25E+02 1.30E+02 1.20E+02 10 1.14E+02 1.13E+02 1.14E+02 1.16E+02 1.18E+02 1.36E+02 1.38E+02 1.22E+02 1.27E+02 1.35E+02 1.22E+02 20 1.12E+02 1.13E+02 1.14E+02 1.15E+02 1.21E+02 1.38E+02 1.38E+02 1.25E+02 1.20E+02 1.33E+02 1.23E+02 30 1.12E+02 1.12E+02 1.14E+02 1.14E+02 1.21E+02 1.27E+02 1.25E+02 1.19E+02 1.29E+02 1.27E+02 1.22E+02 50 1.11E+02 1.10E+02 1.12E+02 1.12E+02 1.21E+02 1.24E+02 1.40E+02 1.16E+02 1.34E+02 1.25E+02 1.21E+02 60 1.11E+02 1.11E+02 1.14E+02 1.13E+02 1.17E+02 1.34E+02 1.26E+02 1.19E+02 1.21E+02 1.23E+02 1.25E+02 70 1.09E+02 1.10E+02 1.12E+02 1.15E+02 1.19E+02 1.26E+02 1.31E+02 1.19E+02 1.27E+02 1.25E+02 1.18E+02 1.17E+02 4.99E+00 1.31E+02 1.03E+02 1.15E+02 1.94E+00 1.21E+02 1.10E+02 1.15E+02 3.51E+00 1.24E+02 1.05E+02 1.15E+02 3.67E+00 1.25E+02 1.05E+02 1.13E+02 4.28E+00 1.25E+02 1.01E+02 1.13E+02 2.45E+00 1.20E+02 1.07E+02 1.13E+02 3.74E+00 1.23E+02 1.03E+02 1.31E+02 8.08E+00 1.53E+02 1.09E+02 1.00E+02 PASS 1.32E+02 6.58E+00 1.50E+02 1.14E+02 1.00E+02 PASS 1.31E+02 7.84E+00 1.52E+02 1.09E+02 1.00E+02 PASS 1.25E+02 3.82E+00 1.36E+02 1.15E+02 1.00E+02 PASS 1.28E+02 9.37E+00 1.53E+02 1.02E+02 9.80E+01 PASS 1.25E+02 5.93E+00 1.41E+02 1.08E+02 9.80E+01 PASS 1.26E+02 4.46E+00 1.38E+02 1.13E+02 9.80E+01 PASS An ISO 9001:2000 Certified Company 35 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=open (V/mV) 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.15. Plot of Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 36 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.15. Raw data for Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=open (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.63E+03 1.25E+03 1.45E+03 1.51E+03 1.40E+03 1.22E+03 1.20E+03 1.21E+03 1.26E+03 1.33E+03 1.35E+03 10 1.01E+03 1.29E+03 1.11E+03 1.45E+03 1.27E+03 1.22E+03 1.17E+03 1.21E+03 1.11E+03 1.25E+03 1.22E+03 20 1.23E+03 1.11E+03 1.12E+03 1.24E+03 1.34E+03 1.26E+03 1.31E+03 9.35E+02 1.04E+03 1.07E+03 1.09E+03 30 1.17E+03 1.29E+03 1.48E+03 1.12E+03 1.47E+03 1.03E+03 1.57E+03 1.04E+03 9.90E+02 9.69E+02 1.34E+03 50 1.98E+03 1.45E+03 1.57E+03 1.46E+03 1.39E+03 1.16E+03 1.23E+03 1.19E+03 1.04E+03 1.81E+03 1.14E+03 60 1.76E+03 1.32E+03 1.20E+03 1.28E+03 1.21E+03 9.93E+02 1.18E+03 9.83E+02 1.22E+03 1.05E+03 1.39E+03 70 1.46E+03 1.31E+03 1.27E+03 1.66E+03 1.40E+03 1.43E+03 1.33E+03 1.20E+03 1.66E+03 1.35E+03 1.37E+03 1.45E+03 1.39E+02 1.83E+03 1.07E+03 1.23E+03 1.70E+02 1.69E+03 7.60E+02 1.21E+03 9.39E+01 1.47E+03 9.51E+02 1.30E+03 1.65E+02 1.76E+03 8.53E+02 1.57E+03 2.40E+02 2.23E+03 9.14E+02 1.35E+03 2.30E+02 1.99E+03 7.23E+02 1.42E+03 1.57E+02 1.85E+03 9.90E+02 1.24E+03 5.28E+01 1.39E+03 1.10E+03 1.50E+02 PASS 1.19E+03 5.49E+01 1.34E+03 1.04E+03 1.50E+02 PASS 1.12E+03 1.58E+02 1.55E+03 6.89E+02 1.50E+02 PASS 1.12E+03 2.52E+02 1.81E+03 4.28E+02 1.50E+02 PASS 1.29E+03 3.02E+02 2.11E+03 4.58E+02 1.00E+02 PASS 1.08E+03 1.09E+02 1.38E+03 7.87E+02 1.00E+02 PASS 1.39E+03 1.71E+02 1.86E+03 9.24E+02 1.00E+02 PASS An ISO 9001:2000 Certified Company 37 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=open (V/mV) 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.16. Plot of Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 38 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.16. Raw data for Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=open (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.47E+03 1.42E+03 1.34E+03 1.35E+03 1.24E+03 1.18E+03 1.20E+03 1.37E+03 1.18E+03 1.29E+03 1.33E+03 10 1.27E+03 1.24E+03 1.07E+03 1.22E+03 1.09E+03 1.32E+03 1.03E+03 1.16E+03 9.58E+02 1.14E+03 1.33E+03 20 1.30E+03 1.15E+03 1.22E+03 1.27E+03 1.12E+03 1.27E+03 1.34E+03 1.11E+03 1.07E+03 1.26E+03 1.16E+03 30 1.22E+03 1.33E+03 1.19E+03 1.28E+03 1.12E+03 1.05E+03 1.13E+03 1.22E+03 1.02E+03 1.19E+03 1.44E+03 50 1.76E+03 1.67E+03 1.43E+03 1.19E+03 1.47E+03 1.38E+03 1.14E+03 1.23E+03 1.11E+03 1.19E+03 1.06E+03 60 1.22E+03 1.27E+03 1.56E+03 1.30E+03 1.38E+03 1.06E+03 1.15E+03 1.06E+03 8.71E+02 1.17E+03 1.23E+03 70 1.90E+03 1.19E+03 1.45E+03 1.35E+03 1.31E+03 1.26E+03 1.29E+03 1.47E+03 1.17E+03 1.31E+03 1.29E+03 1.36E+03 8.95E+01 1.61E+03 1.12E+03 1.18E+03 9.16E+01 1.43E+03 9.27E+02 1.21E+03 7.69E+01 1.42E+03 1.00E+03 1.23E+03 8.12E+01 1.45E+03 1.00E+03 1.50E+03 2.26E+02 2.12E+03 8.84E+02 1.35E+03 1.32E+02 1.71E+03 9.84E+02 1.44E+03 2.72E+02 2.18E+03 6.94E+02 1.24E+03 8.56E+01 1.48E+03 1.01E+03 1.50E+02 PASS 1.12E+03 1.37E+02 1.50E+03 7.46E+02 1.50E+02 PASS 1.21E+03 1.15E+02 1.52E+03 8.94E+02 1.50E+02 PASS 1.12E+03 8.70E+01 1.36E+03 8.83E+02 1.50E+02 PASS 1.21E+03 1.07E+02 1.50E+03 9.19E+02 1.00E+02 PASS 1.06E+03 1.19E+02 1.39E+03 7.35E+02 1.00E+02 PASS 1.30E+03 1.08E+02 1.59E+03 1.00E+03 1.00E+02 PASS An ISO 9001:2000 Certified Company 39 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) 2.00E+03 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.17. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show substantial degradation with radiation, however it is not sufficient for the parameter to exceed its postirradiation test limits. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 40 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.17. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.30E+03 1.33E+03 1.45E+03 1.39E+03 1.31E+03 1.89E+03 1.56E+03 2.02E+03 1.78E+03 1.45E+03 1.42E+03 10 1.04E+03 1.09E+03 1.21E+03 1.47E+03 1.12E+03 1.46E+03 1.17E+03 1.66E+03 1.50E+03 1.81E+03 1.68E+03 20 1.04E+03 1.05E+03 1.13E+03 8.74E+02 8.74E+02 1.21E+03 1.08E+03 1.03E+03 1.32E+03 1.09E+03 1.48E+03 30 8.58E+02 8.42E+02 9.41E+02 8.09E+02 6.63E+02 9.79E+02 1.00E+03 1.10E+03 8.49E+02 8.45E+02 2.02E+03 50 5.70E+02 5.15E+02 6.28E+02 5.56E+02 5.27E+02 7.54E+02 6.97E+02 5.86E+02 6.07E+02 6.03E+02 1.40E+03 60 6.24E+02 6.31E+02 6.86E+02 6.37E+02 5.24E+02 9.28E+02 8.15E+02 8.28E+02 7.49E+02 8.63E+02 1.51E+03 70 6.88E+02 9.64E+02 8.83E+02 9.75E+02 6.80E+02 1.10E+03 1.28E+03 1.30E+03 1.21E+03 1.11E+03 1.62E+03 1.36E+03 6.31E+01 1.53E+03 1.18E+03 1.19E+03 1.73E+02 1.66E+03 7.13E+02 9.95E+02 1.15E+02 1.31E+03 6.78E+02 8.23E+02 1.02E+02 1.10E+03 5.44E+02 5.59E+02 4.47E+01 6.82E+02 4.37E+02 6.20E+02 5.90E+01 7.82E+02 4.59E+02 8.38E+02 1.45E+02 1.23E+03 4.41E+02 1.74E+03 2.34E+02 2.38E+03 1.10E+03 1.20E+02 PASS 1.52E+03 2.42E+02 2.18E+03 8.56E+02 1.20E+02 PASS 1.14E+03 1.18E+02 1.47E+03 8.21E+02 1.20E+02 PASS 9.56E+02 1.11E+02 1.26E+03 6.53E+02 5.00E+01 PASS 6.49E+02 7.26E+01 8.48E+02 4.50E+02 2.00E+01 PASS 8.36E+02 6.59E+01 1.02E+03 6.56E+02 2.00E+01 PASS 1.20E+03 9.16E+01 1.45E+03 9.48E+02 2.00E+01 PASS An ISO 9001:2000 Certified Company 41 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.18. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show substantial degradation with radiation, however it is not sufficient for any of the individual units to exceed the post-irradiation test limits. Note that the KTL values are out of specification pre-irradiation and throughout the measurement. As discussed in the text of this report we attribute this to the large standard deviation within the sample population caused by the sensitivity of the measurement to input conditions. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in An ISO 9001:2000 Certified Company 42 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.18. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.12E+03 1.20E+03 1.24E+03 1.11E+03 1.37E+03 1.94E+03 2.35E+03 1.59E+03 3.06E+03 2.29E+03 1.51E+03 10 1.12E+03 1.24E+03 1.07E+03 1.06E+03 1.12E+03 1.95E+03 2.06E+03 1.28E+03 1.81E+03 1.76E+03 1.48E+03 20 8.10E+02 9.55E+02 9.36E+02 9.36E+02 1.10E+03 1.38E+03 1.57E+03 1.14E+03 2.00E+03 1.13E+03 1.77E+03 30 7.74E+02 8.42E+02 7.09E+02 7.28E+02 9.50E+02 1.02E+03 1.31E+03 1.01E+03 1.57E+03 1.27E+03 1.35E+03 50 5.11E+02 5.02E+02 5.48E+02 6.09E+02 6.57E+02 6.67E+02 1.20E+03 7.35E+02 7.75E+02 7.48E+02 1.39E+03 60 5.56E+02 5.58E+02 5.18E+02 6.04E+02 6.99E+02 8.31E+02 1.10E+03 7.80E+02 8.63E+02 9.01E+02 1.42E+03 70 5.42E+02 7.45E+02 7.72E+02 7.32E+02 9.46E+02 1.33E+03 1.56E+03 9.90E+02 1.74E+03 1.45E+03 1.67E+03 1.21E+03 1.06E+02 1.50E+03 9.17E+02 1.12E+03 7.43E+01 1.33E+03 9.19E+02 9.47E+02 1.02E+02 1.23E+03 6.67E+02 8.00E+02 9.83E+01 1.07E+03 5.31E+02 5.66E+02 6.64E+01 7.48E+02 3.83E+02 5.87E+02 6.97E+01 7.78E+02 3.96E+02 7.47E+02 1.44E+02 1.14E+03 3.53E+02 2.24E+03 5.46E+02 3.74E+03 7.46E+02 1.20E+02 PASS 1.77E+03 2.98E+02 2.59E+03 9.54E+02 1.20E+02 PASS 1.44E+03 3.59E+02 2.43E+03 4.59E+02 1.20E+02 PASS 1.24E+03 2.32E+02 1.87E+03 6.00E+02 5.00E+01 PASS 8.25E+02 2.12E+02 1.41E+03 2.43E+02 2.00E+01 PASS 8.95E+02 1.23E+02 1.23E+03 5.58E+02 2.00E+01 PASS 1.41E+03 2.82E+02 2.19E+03 6.40E+02 2.00E+01 PASS An ISO 9001:2000 Certified Company 43 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=open (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.19. Plot of Open Loop Gain 1 @ +5V, RL=open (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 44 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.19. Raw data for Open Loop Gain 1 @ +5V, RL=open (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=open (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.24E+02 1.22E+02 1.23E+02 1.24E+02 1.23E+02 1.22E+02 1.22E+02 1.22E+02 1.22E+02 1.22E+02 1.23E+02 10 1.20E+02 1.22E+02 1.21E+02 1.23E+02 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.21E+02 1.22E+02 1.22E+02 20 1.22E+02 1.21E+02 1.21E+02 1.22E+02 1.23E+02 1.22E+02 1.22E+02 1.19E+02 1.20E+02 1.21E+02 1.21E+02 30 1.21E+02 1.22E+02 1.23E+02 1.21E+02 1.23E+02 1.20E+02 1.24E+02 1.20E+02 1.20E+02 1.20E+02 1.23E+02 50 1.26E+02 1.23E+02 1.24E+02 1.23E+02 1.23E+02 1.21E+02 1.22E+02 1.21E+02 1.20E+02 1.25E+02 1.21E+02 60 1.25E+02 1.22E+02 1.22E+02 1.22E+02 1.22E+02 1.20E+02 1.21E+02 1.20E+02 1.22E+02 1.20E+02 1.23E+02 70 1.23E+02 1.22E+02 1.22E+02 1.24E+02 1.23E+02 1.23E+02 1.22E+02 1.22E+02 1.24E+02 1.23E+02 1.23E+02 1.23E+02 8.43E-01 1.27E+02 1.19E+02 1.22E+02 1.22E+00 1.27E+02 1.16E+02 1.22E+02 6.72E-01 1.25E+02 1.18E+02 1.22E+02 1.10E+00 1.27E+02 1.17E+02 1.24E+02 1.23E+00 1.30E+02 1.18E+02 1.23E+02 1.36E+00 1.29E+02 1.16E+02 1.23E+02 9.32E-01 1.27E+02 1.19E+02 1.22E+02 3.62E-01 1.24E+02 1.20E+02 1.04E+02 PASS 1.22E+02 4.06E-01 1.23E+02 1.20E+02 1.04E+02 PASS 1.21E+02 1.22E+00 1.27E+02 1.15E+02 1.04E+02 PASS 1.21E+02 1.74E+00 1.29E+02 1.13E+02 1.04E+02 PASS 1.22E+02 1.83E+00 1.31E+02 1.13E+02 1.00E+02 PASS 1.21E+02 8.61E-01 1.25E+02 1.17E+02 1.00E+02 PASS 1.23E+02 1.04E+00 1.28E+02 1.18E+02 1.00E+02 PASS An ISO 9001:2000 Certified Company 45 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=open (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.20. Plot of Open Loop Gain 2 @ +5V, RL=open (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 46 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.20. Raw data for Open Loop Gain 2 @ +5V, RL=open (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=open (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.23E+02 1.23E+02 1.23E+02 1.23E+02 1.22E+02 1.21E+02 1.22E+02 1.23E+02 1.21E+02 1.22E+02 1.22E+02 10 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.21E+02 1.22E+02 1.20E+02 1.21E+02 1.20E+02 1.21E+02 1.22E+02 20 1.22E+02 1.21E+02 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.23E+02 1.21E+02 1.21E+02 1.22E+02 1.21E+02 30 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.21E+02 1.20E+02 1.21E+02 1.22E+02 1.20E+02 1.21E+02 1.23E+02 50 1.25E+02 1.24E+02 1.23E+02 1.21E+02 1.23E+02 1.23E+02 1.21E+02 1.22E+02 1.21E+02 1.22E+02 1.20E+02 60 1.22E+02 1.22E+02 1.24E+02 1.22E+02 1.23E+02 1.20E+02 1.21E+02 1.20E+02 1.19E+02 1.21E+02 1.22E+02 70 1.26E+02 1.22E+02 1.23E+02 1.23E+02 1.22E+02 1.22E+02 1.22E+02 1.23E+02 1.21E+02 1.22E+02 1.22E+02 1.23E+02 5.74E-01 1.25E+02 1.20E+02 1.21E+02 6.85E-01 1.25E+02 1.18E+02 1.22E+02 5.53E-01 1.24E+02 1.19E+02 1.22E+02 5.78E-01 1.24E+02 1.19E+02 1.23E+02 1.35E+00 1.30E+02 1.17E+02 1.23E+02 8.29E-01 1.26E+02 1.19E+02 1.23E+02 1.53E+00 1.30E+02 1.16E+02 1.22E+02 5.86E-01 1.25E+02 1.19E+02 1.04E+02 PASS 1.21E+02 1.06E+00 1.26E+02 1.16E+02 1.04E+02 PASS 1.22E+02 8.37E-01 1.26E+02 1.18E+02 1.04E+02 PASS 1.21E+02 6.79E-01 1.24E+02 1.18E+02 1.04E+02 PASS 1.22E+02 7.42E-01 1.25E+02 1.18E+02 1.00E+02 PASS 1.20E+02 1.02E+00 1.25E+02 1.16E+02 1.00E+02 PASS 1.22E+02 7.11E-01 1.26E+02 1.19E+02 1.00E+02 PASS An ISO 9001:2000 Certified Company 47 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 3 @ +5V, RL=50k (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.21. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (dB) versus total dose. The data show some degradation with radiation, however not sufficient to cause the parameter to exceed the specification value. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 48 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.21. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 3 @ +5V, RL=50k (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.22E+02 1.23E+02 1.23E+02 1.23E+02 1.22E+02 1.26E+02 1.24E+02 1.26E+02 1.25E+02 1.23E+02 1.23E+02 10 1.20E+02 1.21E+02 1.22E+02 1.23E+02 1.21E+02 1.23E+02 1.21E+02 1.24E+02 1.23E+02 1.25E+02 1.24E+02 20 1.20E+02 1.20E+02 1.21E+02 1.19E+02 1.19E+02 1.22E+02 1.21E+02 1.20E+02 1.22E+02 1.21E+02 1.23E+02 30 1.19E+02 1.19E+02 1.19E+02 1.18E+02 1.16E+02 1.20E+02 1.20E+02 1.21E+02 1.19E+02 1.19E+02 1.26E+02 50 1.15E+02 1.14E+02 1.16E+02 1.15E+02 1.14E+02 1.18E+02 1.17E+02 1.15E+02 1.16E+02 1.16E+02 1.23E+02 60 1.16E+02 1.16E+02 1.17E+02 1.16E+02 1.14E+02 1.19E+02 1.18E+02 1.18E+02 1.17E+02 1.19E+02 1.24E+02 70 1.17E+02 1.20E+02 1.19E+02 1.20E+02 1.17E+02 1.21E+02 1.22E+02 1.22E+02 1.22E+02 1.21E+02 1.24E+02 1.23E+02 3.99E-01 1.25E+02 1.21E+02 1.21E+02 1.20E+00 1.27E+02 1.16E+02 1.20E+02 1.02E+00 1.25E+02 1.15E+02 1.18E+02 1.12E+00 1.23E+02 1.13E+02 1.15E+02 6.81E-01 1.18E+02 1.12E+02 1.16E+02 8.61E-01 1.20E+02 1.12E+02 1.18E+02 1.55E+00 1.26E+02 1.11E+02 1.25E+02 1.18E+00 1.30E+02 1.19E+02 1.02E+02 PASS 1.24E+02 1.44E+00 1.30E+02 1.17E+02 1.02E+02 PASS 1.21E+02 8.76E-01 1.25E+02 1.17E+02 1.02E+02 PASS 1.20E+02 1.00E+00 1.24E+02 1.15E+02 9.40E+01 PASS 1.16E+02 9.47E-01 1.21E+02 1.12E+02 8.60E+01 PASS 1.18E+02 6.85E-01 1.22E+02 1.15E+02 8.60E+01 PASS 1.22E+02 6.67E-01 1.25E+02 1.18E+02 8.60E+01 PASS An ISO 9001:2000 Certified Company 49 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Ps99%/90% (-KTL) Biased Open Loop Gain 4 @ +5V, RL=50k (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.22. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (dB) versus total dose. The data show some degradation with radiation, however not sufficient to cause the parameter to exceed the final post-irradiation specification value. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 50 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.22. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 4 @ +5V, RL=50k (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps99%/90% (+KTL) Biased Ps99%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps99%/90% (+KTL) Un-Biased Ps99%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.21E+02 1.22E+02 1.22E+02 1.21E+02 1.23E+02 1.26E+02 1.27E+02 1.24E+02 1.30E+02 1.27E+02 1.24E+02 10 1.21E+02 1.22E+02 1.21E+02 1.20E+02 1.21E+02 1.26E+02 1.26E+02 1.22E+02 1.25E+02 1.25E+02 1.23E+02 20 1.18E+02 1.20E+02 1.19E+02 1.19E+02 1.21E+02 1.23E+02 1.24E+02 1.21E+02 1.26E+02 1.21E+02 1.25E+02 30 1.18E+02 1.19E+02 1.17E+02 1.17E+02 1.20E+02 1.20E+02 1.22E+02 1.20E+02 1.24E+02 1.22E+02 1.23E+02 50 1.14E+02 1.14E+02 1.15E+02 1.16E+02 1.16E+02 1.16E+02 1.22E+02 1.17E+02 1.18E+02 1.17E+02 1.23E+02 60 1.15E+02 1.15E+02 1.14E+02 1.16E+02 1.17E+02 1.18E+02 1.21E+02 1.18E+02 1.19E+02 1.19E+02 1.23E+02 70 1.15E+02 1.17E+02 1.18E+02 1.17E+02 1.20E+02 1.22E+02 1.24E+02 1.20E+02 1.25E+02 1.23E+02 1.24E+02 1.22E+02 7.45E-01 1.25E+02 1.18E+02 1.21E+02 5.61E-01 1.24E+02 1.18E+02 1.19E+02 9.35E-01 1.24E+02 1.15E+02 1.18E+02 1.04E+00 1.23E+02 1.13E+02 1.15E+02 1.00E+00 1.20E+02 1.10E+02 1.15E+02 9.95E-01 1.20E+02 1.11E+02 1.17E+02 1.73E+00 1.25E+02 1.09E+02 1.27E+02 2.11E+00 1.37E+02 1.17E+02 1.02E+02 PASS 1.25E+02 1.60E+00 1.32E+02 1.17E+02 1.02E+02 PASS 1.23E+02 2.07E+00 1.33E+02 1.13E+02 1.02E+02 PASS 1.22E+02 1.61E+00 1.29E+02 1.14E+02 9.40E+01 PASS 1.18E+02 1.98E+00 1.27E+02 1.09E+02 8.60E+01 PASS 1.19E+02 1.13E+00 1.24E+02 1.14E+02 8.60E+01 PASS 1.23E+02 1.86E+00 1.32E+02 1.14E+02 8.60E+01 PASS An ISO 9001:2000 Certified Company 51 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V RL=open (V) 1.40E-02 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.23. Plot of Output Voltage Low 1 @ +5V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 52 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.23. Raw data for Output Voltage Low 1 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.47E-03 4.48E-03 4.40E-03 4.45E-03 4.42E-03 4.30E-03 4.40E-03 4.26E-03 4.42E-03 4.20E-03 4.35E-03 10 4.70E-03 4.57E-03 4.59E-03 4.69E-03 4.60E-03 4.42E-03 4.52E-03 4.50E-03 4.52E-03 4.45E-03 4.35E-03 20 4.92E-03 4.77E-03 4.84E-03 4.97E-03 4.91E-03 4.74E-03 4.70E-03 4.69E-03 4.92E-03 4.70E-03 4.32E-03 30 5.07E-03 4.96E-03 5.04E-03 5.19E-03 5.04E-03 4.87E-03 4.99E-03 4.87E-03 5.16E-03 4.96E-03 4.23E-03 50 5.53E-03 5.36E-03 5.46E-03 5.58E-03 5.56E-03 5.38E-03 5.51E-03 5.46E-03 5.93E-03 5.44E-03 4.37E-03 60 5.44E-03 5.26E-03 5.51E-03 5.46E-03 5.53E-03 5.31E-03 5.37E-03 5.36E-03 5.75E-03 5.36E-03 4.41E-03 70 5.34E-03 4.96E-03 5.17E-03 5.36E-03 5.31E-03 4.82E-03 4.96E-03 4.92E-03 5.19E-03 4.94E-03 4.28E-03 4.44E-03 3.36E-05 4.54E-03 4.35E-03 4.63E-03 6.04E-05 4.80E-03 4.46E-03 4.88E-03 7.79E-05 5.10E-03 4.67E-03 5.06E-03 8.34E-05 5.29E-03 4.83E-03 5.50E-03 8.96E-05 5.74E-03 5.25E-03 5.44E-03 1.07E-04 5.73E-03 5.15E-03 5.23E-03 1.67E-04 5.69E-03 4.77E-03 4.32E-03 9.32E-05 4.57E-03 4.06E-03 6.00E-03 PASS 4.48E-03 4.49E-05 4.61E-03 4.36E-03 6.00E-03 PASS 4.75E-03 9.70E-05 5.02E-03 4.48E-03 6.00E-03 PASS 4.97E-03 1.19E-04 5.30E-03 4.64E-03 9.00E-03 PASS 5.54E-03 2.21E-04 6.15E-03 4.94E-03 1.30E-02 PASS 5.43E-03 1.80E-04 5.92E-03 4.94E-03 1.30E-02 PASS 4.97E-03 1.36E-04 5.34E-03 4.59E-03 1.30E-02 PASS An ISO 9001:2000 Certified Company 53 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V RL=open (V) 1.40E-02 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.24. Plot of Output Voltage Low 2 @ +5V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 54 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.24. Raw data for Output Voltage Low 2 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.31E-03 4.20E-03 4.31E-03 4.26E-03 4.16E-03 4.15E-03 4.11E-03 4.11E-03 4.01E-03 4.15E-03 4.13E-03 10 4.50E-03 4.27E-03 4.45E-03 4.45E-03 4.15E-03 4.13E-03 4.01E-03 4.06E-03 3.93E-03 4.15E-03 4.13E-03 20 4.75E-03 4.49E-03 4.67E-03 4.54E-03 4.47E-03 4.33E-03 4.35E-03 4.37E-03 4.28E-03 4.35E-03 4.15E-03 30 4.91E-03 4.62E-03 4.84E-03 4.70E-03 4.64E-03 4.60E-03 4.57E-03 4.55E-03 4.69E-03 4.74E-03 4.05E-03 50 5.40E-03 5.07E-03 5.38E-03 5.29E-03 5.11E-03 5.04E-03 5.02E-03 5.04E-03 5.36E-03 5.21E-03 4.08E-03 60 5.36E-03 5.12E-03 5.22E-03 5.16E-03 5.11E-03 4.97E-03 4.97E-03 4.97E-03 5.12E-03 5.04E-03 4.16E-03 70 5.16E-03 4.67E-03 5.04E-03 5.07E-03 4.79E-03 4.57E-03 4.45E-03 4.54E-03 4.45E-03 4.55E-03 4.11E-03 4.25E-03 6.69E-05 4.43E-03 4.06E-03 4.36E-03 1.48E-04 4.77E-03 3.96E-03 4.58E-03 1.21E-04 4.92E-03 4.25E-03 4.74E-03 1.27E-04 5.09E-03 4.39E-03 5.25E-03 1.52E-04 5.67E-03 4.83E-03 5.19E-03 1.02E-04 5.47E-03 4.91E-03 4.95E-03 2.06E-04 5.51E-03 4.38E-03 4.11E-03 5.73E-05 4.26E-03 3.95E-03 6.00E-03 PASS 4.06E-03 8.99E-05 4.30E-03 3.81E-03 6.00E-03 PASS 4.34E-03 3.44E-05 4.43E-03 4.24E-03 6.00E-03 PASS 4.63E-03 8.15E-05 4.85E-03 4.41E-03 9.00E-03 PASS 5.13E-03 1.48E-04 5.54E-03 4.73E-03 1.30E-02 PASS 5.01E-03 6.66E-05 5.20E-03 4.83E-03 1.30E-02 PASS 4.51E-03 5.76E-05 4.67E-03 4.35E-03 1.30E-02 PASS An ISO 9001:2000 Certified Company 55 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V RL=2kΩ (V) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.25. Plot of Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 56 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.25. Raw data for Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.30E-04 1.01E-03 9.40E-04 8.70E-04 9.10E-04 9.40E-04 9.70E-04 9.80E-04 9.80E-04 9.80E-04 9.30E-04 10 9.40E-04 9.70E-04 8.90E-04 8.80E-04 9.00E-04 9.20E-04 9.60E-04 9.50E-04 9.50E-04 9.50E-04 8.90E-04 20 8.90E-04 9.20E-04 8.70E-04 8.50E-04 8.90E-04 9.30E-04 9.40E-04 9.30E-04 9.40E-04 9.30E-04 9.20E-04 30 8.30E-04 8.50E-04 7.80E-04 7.70E-04 7.90E-04 9.40E-04 9.40E-04 9.00E-04 9.40E-04 8.90E-04 9.00E-04 50 7.80E-04 7.80E-04 7.70E-04 7.30E-04 7.70E-04 9.10E-04 8.90E-04 8.70E-04 8.80E-04 9.00E-04 9.10E-04 60 8.40E-04 8.90E-04 8.50E-04 7.80E-04 8.50E-04 9.20E-04 9.00E-04 9.00E-04 9.40E-04 8.90E-04 9.20E-04 70 8.20E-04 9.00E-04 7.80E-04 8.10E-04 8.20E-04 9.20E-04 9.00E-04 9.20E-04 9.30E-04 9.30E-04 9.80E-04 9.32E-04 5.12E-05 1.07E-03 7.92E-04 9.16E-04 3.78E-05 1.02E-03 8.12E-04 8.84E-04 2.61E-05 9.56E-04 8.12E-04 8.04E-04 3.44E-05 8.98E-04 7.10E-04 7.66E-04 2.07E-05 8.23E-04 7.09E-04 8.42E-04 3.96E-05 9.51E-04 7.33E-04 8.26E-04 4.45E-05 9.48E-04 7.04E-04 9.70E-04 1.73E-05 1.02E-03 9.23E-04 2.00E-03 PASS 9.46E-04 1.52E-05 9.88E-04 9.04E-04 2.00E-03 PASS 9.34E-04 5.48E-06 9.49E-04 9.19E-04 2.00E-03 PASS 9.22E-04 2.49E-05 9.90E-04 8.54E-04 2.00E-03 PASS 8.90E-04 1.58E-05 9.33E-04 8.47E-04 2.00E-03 PASS 9.10E-04 2.00E-05 9.65E-04 8.55E-04 2.00E-03 PASS 9.20E-04 1.22E-05 9.54E-04 8.86E-04 2.00E-03 PASS An ISO 9001:2000 Certified Company 57 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V RL=2kΩ (V) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.26. Plot of Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 58 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.26. Raw data for Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.30E-04 9.40E-04 8.70E-04 9.00E-04 9.20E-04 9.00E-04 8.80E-04 9.40E-04 9.80E-04 8.80E-04 9.20E-04 10 8.30E-04 9.00E-04 8.30E-04 8.60E-04 8.60E-04 8.80E-04 8.90E-04 8.60E-04 9.50E-04 8.60E-04 8.70E-04 20 8.20E-04 8.70E-04 8.00E-04 8.40E-04 8.70E-04 8.80E-04 8.30E-04 8.70E-04 9.50E-04 8.50E-04 8.80E-04 30 7.20E-04 7.80E-04 7.20E-04 7.50E-04 7.40E-04 8.90E-04 8.80E-04 8.50E-04 9.60E-04 8.70E-04 8.60E-04 50 6.90E-04 7.40E-04 7.10E-04 7.10E-04 7.50E-04 8.40E-04 8.50E-04 8.60E-04 9.10E-04 8.40E-04 8.90E-04 60 7.50E-04 8.30E-04 8.20E-04 8.00E-04 8.30E-04 8.80E-04 8.50E-04 8.60E-04 9.40E-04 8.50E-04 8.80E-04 70 7.70E-04 8.30E-04 7.70E-04 7.70E-04 7.90E-04 8.40E-04 8.70E-04 8.70E-04 9.80E-04 8.50E-04 9.10E-04 8.92E-04 4.32E-05 1.01E-03 7.73E-04 8.56E-04 2.88E-05 9.35E-04 7.77E-04 8.40E-04 3.08E-05 9.25E-04 7.55E-04 7.42E-04 2.49E-05 8.10E-04 6.74E-04 7.20E-04 2.45E-05 7.87E-04 6.53E-04 8.06E-04 3.36E-05 8.98E-04 7.14E-04 7.86E-04 2.61E-05 8.58E-04 7.14E-04 9.16E-04 4.34E-05 1.03E-03 7.97E-04 2.00E-03 PASS 8.88E-04 3.70E-05 9.89E-04 7.87E-04 2.00E-03 PASS 8.76E-04 4.56E-05 1.00E-03 7.51E-04 2.00E-03 PASS 8.90E-04 4.18E-05 1.00E-03 7.75E-04 2.00E-03 PASS 8.60E-04 2.92E-05 9.40E-04 7.80E-04 2.00E-03 PASS 8.76E-04 3.78E-05 9.80E-04 7.72E-04 2.00E-03 PASS 8.82E-04 5.63E-05 1.04E-03 7.28E-04 2.00E-03 PASS An ISO 9001:2000 Certified Company 59 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V IL=100uA (V) 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.27. Plot of Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 60 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.27. Raw data for Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V IL=100uA (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.80E-02 8.64E-02 8.74E-02 8.90E-02 8.71E-02 8.51E-02 8.59E-02 8.50E-02 8.51E-02 8.62E-02 8.67E-02 10 8.95E-02 8.80E-02 8.90E-02 9.05E-02 8.86E-02 8.66E-02 8.73E-02 8.66E-02 8.70E-02 8.79E-02 8.75E-02 20 9.05E-02 8.93E-02 9.03E-02 9.17E-02 9.02E-02 8.80E-02 8.84E-02 8.81E-02 8.84E-02 8.92E-02 8.75E-02 30 9.15E-02 9.00E-02 9.12E-02 9.28E-02 9.10E-02 8.88E-02 8.99E-02 8.89E-02 8.98E-02 9.01E-02 8.75E-02 50 9.37E-02 9.22E-02 9.34E-02 9.51E-02 9.31E-02 9.10E-02 9.22E-02 9.13E-02 9.26E-02 9.27E-02 8.78E-02 60 9.45E-02 9.28E-02 9.40E-02 9.58E-02 9.35E-02 9.15E-02 9.24E-02 9.15E-02 9.26E-02 9.28E-02 8.79E-02 70 9.37E-02 9.07E-02 9.31E-02 9.49E-02 9.27E-02 8.89E-02 8.95E-02 8.89E-02 8.94E-02 8.99E-02 8.68E-02 8.76E-02 9.88E-04 9.03E-02 8.49E-02 8.91E-02 9.20E-04 9.17E-02 8.66E-02 9.04E-02 8.41E-04 9.27E-02 8.81E-02 9.13E-02 1.03E-03 9.41E-02 8.85E-02 9.35E-02 1.07E-03 9.64E-02 9.05E-02 9.41E-02 1.11E-03 9.72E-02 9.11E-02 9.30E-02 1.56E-03 9.73E-02 8.87E-02 8.55E-02 5.47E-04 8.70E-02 8.40E-02 1.30E-01 PASS 8.71E-02 5.20E-04 8.85E-02 8.57E-02 1.30E-01 PASS 8.84E-02 4.53E-04 8.97E-02 8.72E-02 1.30E-01 PASS 8.95E-02 5.98E-04 9.12E-02 8.79E-02 1.40E-01 PASS 9.19E-02 7.72E-04 9.40E-02 8.98E-02 1.50E-01 PASS 9.22E-02 5.80E-04 9.37E-02 9.06E-02 1.50E-01 PASS 8.93E-02 4.31E-04 9.05E-02 8.81E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 61 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V IL=100uA (V) 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.28. Plot of Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 62 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.28. Raw data for Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V IL=100uA (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.79E-02 8.54E-02 8.69E-02 8.73E-02 8.51E-02 8.39E-02 8.38E-02 8.38E-02 8.13E-02 8.53E-02 8.60E-02 10 8.95E-02 8.69E-02 8.86E-02 8.86E-02 8.65E-02 8.54E-02 8.53E-02 8.53E-02 8.31E-02 8.69E-02 8.67E-02 20 9.05E-02 8.83E-02 8.97E-02 8.99E-02 8.81E-02 8.69E-02 8.64E-02 8.68E-02 8.45E-02 8.81E-02 8.67E-02 30 9.15E-02 8.88E-02 9.07E-02 9.10E-02 8.90E-02 8.76E-02 8.78E-02 8.77E-02 8.60E-02 8.91E-02 8.68E-02 50 9.38E-02 9.11E-02 9.29E-02 9.32E-02 9.09E-02 8.98E-02 9.02E-02 9.00E-02 8.87E-02 9.16E-02 8.71E-02 60 9.45E-02 9.17E-02 9.35E-02 9.39E-02 9.13E-02 9.03E-02 9.03E-02 9.03E-02 8.85E-02 9.16E-02 8.71E-02 70 9.36E-02 8.95E-02 9.26E-02 9.29E-02 9.04E-02 8.76E-02 8.75E-02 8.76E-02 8.55E-02 8.88E-02 8.61E-02 8.65E-02 1.23E-03 8.99E-02 8.32E-02 8.80E-02 1.28E-03 9.15E-02 8.45E-02 8.93E-02 1.07E-03 9.22E-02 8.63E-02 9.02E-02 1.26E-03 9.37E-02 8.67E-02 9.24E-02 1.32E-03 9.60E-02 8.88E-02 9.30E-02 1.43E-03 9.69E-02 8.91E-02 9.18E-02 1.75E-03 9.66E-02 8.70E-02 8.36E-02 1.46E-03 8.76E-02 7.96E-02 1.30E-01 PASS 8.52E-02 1.36E-03 8.89E-02 8.15E-02 1.30E-01 PASS 8.65E-02 1.30E-03 9.01E-02 8.30E-02 1.30E-01 PASS 8.76E-02 1.11E-03 9.07E-02 8.46E-02 1.40E-01 PASS 9.00E-02 1.04E-03 9.29E-02 8.72E-02 1.50E-01 PASS 9.02E-02 1.09E-03 9.32E-02 8.72E-02 1.50E-01 PASS 8.74E-02 1.19E-03 9.06E-02 8.41E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 63 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +5V RL=open (V) 4.40E+00 4.38E+00 4.36E+00 4.34E+00 4.32E+00 4.30E+00 4.28E+00 4.26E+00 4.24E+00 4.22E+00 4.20E+00 4.18E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.29. Plot of Output Voltage High 1 @ +5V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 64 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.29. Raw data for Output Voltage High 1 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +5V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.30E+00 4.30E+00 4.30E+00 4.31E+00 4.31E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 4.30E+00 10 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 20 4.36E+00 4.36E+00 4.36E+00 4.37E+00 4.37E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.37E+00 4.36E+00 30 4.36E+00 4.36E+00 4.37E+00 4.37E+00 4.37E+00 4.36E+00 4.37E+00 4.36E+00 4.37E+00 4.37E+00 4.36E+00 50 4.37E+00 4.37E+00 4.37E+00 4.38E+00 4.38E+00 4.37E+00 4.37E+00 4.37E+00 4.38E+00 4.37E+00 4.36E+00 60 4.38E+00 4.37E+00 4.38E+00 4.39E+00 4.38E+00 4.37E+00 4.38E+00 4.37E+00 4.38E+00 4.38E+00 4.36E+00 70 4.38E+00 4.36E+00 4.37E+00 4.38E+00 4.37E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.35E+00 4.30E+00 3.70E-03 4.31E+00 4.29E+00 4.36E+00 2.92E-03 4.37E+00 4.35E+00 4.36E+00 3.77E-03 4.37E+00 4.35E+00 4.37E+00 4.77E-03 4.38E+00 4.35E+00 4.37E+00 5.86E-03 4.39E+00 4.36E+00 4.38E+00 5.41E-03 4.39E+00 4.36E+00 4.37E+00 8.12E-03 4.39E+00 4.35E+00 4.30E+00 1.95E-03 4.31E+00 4.30E+00 4.20E+00 PASS 4.36E+00 2.12E-03 4.36E+00 4.35E+00 4.20E+00 PASS 4.36E+00 2.17E-03 4.37E+00 4.36E+00 4.20E+00 PASS 4.36E+00 3.24E-03 4.37E+00 4.36E+00 4.20E+00 PASS 4.37E+00 4.32E-03 4.38E+00 4.36E+00 4.20E+00 PASS 4.37E+00 2.59E-03 4.38E+00 4.37E+00 4.20E+00 PASS 4.36E+00 2.05E-03 4.37E+00 4.36E+00 4.20E+00 PASS An ISO 9001:2000 Certified Company 65 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +5V RL=open (V) 4.38E+00 4.36E+00 4.34E+00 4.32E+00 4.30E+00 4.28E+00 4.26E+00 4.24E+00 4.22E+00 4.20E+00 4.18E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.30. Plot of Output Voltage High 2 @ +5V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 66 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.30. Raw data for Output Voltage High 2 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +5V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.30E+00 4.29E+00 4.30E+00 4.30E+00 4.30E+00 4.29E+00 4.29E+00 4.29E+00 4.29E+00 4.30E+00 4.30E+00 10 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 20 4.36E+00 4.35E+00 4.36E+00 4.36E+00 4.36E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.36E+00 4.35E+00 30 4.36E+00 4.35E+00 4.36E+00 4.36E+00 4.36E+00 4.35E+00 4.36E+00 4.36E+00 4.35E+00 4.36E+00 4.35E+00 50 4.37E+00 4.36E+00 4.37E+00 4.37E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.37E+00 4.36E+00 60 4.37E+00 4.36E+00 4.37E+00 4.37E+00 4.37E+00 4.36E+00 4.37E+00 4.37E+00 4.36E+00 4.37E+00 4.36E+00 70 4.37E+00 4.35E+00 4.36E+00 4.37E+00 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.30E+00 2.70E-03 4.30E+00 4.29E+00 4.35E+00 2.35E-03 4.36E+00 4.35E+00 4.36E+00 1.64E-03 4.36E+00 4.35E+00 4.36E+00 3.00E-03 4.37E+00 4.35E+00 4.36E+00 3.36E-03 4.37E+00 4.35E+00 4.37E+00 3.83E-03 4.38E+00 4.36E+00 4.36E+00 5.22E-03 4.38E+00 4.35E+00 4.29E+00 3.21E-03 4.30E+00 4.28E+00 4.20E+00 PASS 4.35E+00 3.21E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.35E+00 3.70E-03 4.36E+00 4.34E+00 4.20E+00 PASS 4.36E+00 3.16E-03 4.36E+00 4.35E+00 4.20E+00 PASS 4.36E+00 3.70E-03 4.37E+00 4.35E+00 4.20E+00 PASS 4.36E+00 3.58E-03 4.37E+00 4.35E+00 4.20E+00 PASS 4.35E+00 3.32E-03 4.36E+00 4.34E+00 4.20E+00 PASS An ISO 9001:2000 Certified Company 67 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +5V RL=2kΩ (V) 3.95E+00 3.90E+00 3.85E+00 3.80E+00 3.75E+00 3.70E+00 3.65E+00 3.60E+00 3.55E+00 3.50E+00 3.45E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.31. Plot of Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 68 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.31. Raw data for Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +5V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.86E+00 3.86E+00 3.85E+00 3.86E+00 3.86E+00 3.87E+00 3.87E+00 3.87E+00 3.87E+00 3.86E+00 3.86E+00 10 3.91E+00 3.91E+00 3.90E+00 3.91E+00 3.90E+00 3.92E+00 3.91E+00 3.92E+00 3.91E+00 3.91E+00 3.91E+00 20 3.90E+00 3.91E+00 3.90E+00 3.91E+00 3.90E+00 3.91E+00 3.91E+00 3.92E+00 3.91E+00 3.91E+00 3.91E+00 30 3.90E+00 3.91E+00 3.89E+00 3.90E+00 3.90E+00 3.91E+00 3.91E+00 3.91E+00 3.91E+00 3.91E+00 3.91E+00 50 3.90E+00 3.90E+00 3.89E+00 3.90E+00 3.90E+00 3.91E+00 3.91E+00 3.91E+00 3.90E+00 3.90E+00 3.91E+00 60 3.90E+00 3.91E+00 3.90E+00 3.90E+00 3.90E+00 3.91E+00 3.91E+00 3.91E+00 3.90E+00 3.91E+00 3.91E+00 70 3.83E+00 3.91E+00 3.89E+00 3.90E+00 3.90E+00 3.91E+00 3.91E+00 3.91E+00 3.91E+00 3.91E+00 3.90E+00 3.86E+00 4.16E-03 3.87E+00 3.85E+00 3.90E+00 4.88E-03 3.92E+00 3.89E+00 3.90E+00 4.38E-03 3.92E+00 3.89E+00 3.90E+00 4.44E-03 3.91E+00 3.89E+00 3.90E+00 4.22E-03 3.91E+00 3.88E+00 3.90E+00 4.67E-03 3.91E+00 3.89E+00 3.89E+00 3.07E-02 3.97E+00 3.80E+00 3.87E+00 1.67E-03 3.87E+00 3.86E+00 3.50E+00 PASS 3.91E+00 2.59E-03 3.92E+00 3.91E+00 3.50E+00 PASS 3.91E+00 3.05E-03 3.92E+00 3.90E+00 3.50E+00 PASS 3.91E+00 3.13E-03 3.92E+00 3.90E+00 3.50E+00 PASS 3.90E+00 4.39E-03 3.92E+00 3.89E+00 3.50E+00 PASS 3.91E+00 4.24E-03 3.92E+00 3.90E+00 3.50E+00 PASS 3.91E+00 2.88E-03 3.92E+00 3.90E+00 3.50E+00 PASS An ISO 9001:2000 Certified Company 69 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +5V RL=2kΩ (V) 4.00E+00 3.95E+00 3.90E+00 3.85E+00 3.80E+00 3.75E+00 3.70E+00 3.65E+00 3.60E+00 3.55E+00 3.50E+00 3.45E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.32. Plot of Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 70 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.32. Raw data for Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +5V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.89E+00 3.89E+00 3.89E+00 3.89E+00 3.89E+00 3.90E+00 3.90E+00 3.90E+00 3.90E+00 3.89E+00 3.89E+00 10 3.94E+00 3.94E+00 3.93E+00 3.94E+00 3.94E+00 3.95E+00 3.95E+00 3.95E+00 3.95E+00 3.94E+00 3.94E+00 20 3.94E+00 3.94E+00 3.93E+00 3.94E+00 3.94E+00 3.95E+00 3.95E+00 3.95E+00 3.95E+00 3.94E+00 3.94E+00 30 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.94E+00 3.94E+00 3.95E+00 3.95E+00 3.94E+00 3.94E+00 3.94E+00 50 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.94E+00 3.94E+00 3.93E+00 3.93E+00 3.95E+00 60 3.94E+00 3.94E+00 3.93E+00 3.94E+00 3.94E+00 3.95E+00 3.95E+00 3.95E+00 3.94E+00 3.94E+00 3.95E+00 70 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.94E+00 3.95E+00 3.95E+00 3.95E+00 3.94E+00 3.94E+00 3.94E+00 3.89E+00 3.36E-03 3.90E+00 3.88E+00 3.94E+00 3.36E-03 3.95E+00 3.93E+00 3.94E+00 3.78E-03 3.95E+00 3.93E+00 3.93E+00 3.81E-03 3.94E+00 3.92E+00 3.93E+00 3.36E-03 3.94E+00 3.92E+00 3.94E+00 3.54E-03 3.94E+00 3.93E+00 3.93E+00 3.54E-03 3.94E+00 3.92E+00 3.90E+00 4.02E-03 3.91E+00 3.89E+00 3.50E+00 PASS 3.95E+00 4.06E-03 3.96E+00 3.94E+00 3.50E+00 PASS 3.95E+00 4.04E-03 3.96E+00 3.94E+00 3.50E+00 PASS 3.94E+00 4.69E-03 3.96E+00 3.93E+00 3.50E+00 PASS 3.94E+00 5.18E-03 3.95E+00 3.92E+00 3.50E+00 PASS 3.95E+00 5.31E-03 3.96E+00 3.93E+00 3.50E+00 PASS 3.94E+00 4.66E-03 3.96E+00 3.93E+00 3.50E+00 PASS An ISO 9001:2000 Certified Company 71 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E-01 Positive Slew Rate 1 @ +5V (V/us) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.33. Plot of Positive Slew Rate 1 @ +5V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 72 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.33. Raw data for Positive Slew Rate 1 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 1 @ +5V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.10E-02 8.50E-02 8.20E-02 8.00E-02 8.50E-02 8.90E-02 8.80E-02 8.80E-02 9.10E-02 8.60E-02 8.40E-02 10 7.80E-02 8.30E-02 7.90E-02 7.90E-02 8.10E-02 8.60E-02 8.40E-02 8.50E-02 8.80E-02 8.30E-02 8.20E-02 20 7.70E-02 8.10E-02 7.70E-02 7.70E-02 8.00E-02 8.40E-02 8.40E-02 8.30E-02 8.60E-02 8.30E-02 8.30E-02 30 7.40E-02 7.90E-02 7.50E-02 7.40E-02 7.90E-02 8.10E-02 8.20E-02 8.10E-02 8.30E-02 8.00E-02 8.30E-02 50 7.10E-02 7.50E-02 7.20E-02 7.20E-02 7.60E-02 7.80E-02 7.80E-02 7.80E-02 7.80E-02 7.50E-02 8.30E-02 60 7.20E-02 7.80E-02 7.40E-02 7.40E-02 7.60E-02 8.10E-02 7.90E-02 7.90E-02 8.00E-02 7.70E-02 8.40E-02 70 7.20E-02 8.00E-02 7.40E-02 7.40E-02 7.70E-02 8.10E-02 8.40E-02 8.10E-02 8.40E-02 8.00E-02 8.30E-02 8.26E-02 2.30E-03 8.89E-02 7.63E-02 8.00E-02 2.00E-03 8.55E-02 7.45E-02 7.84E-02 1.95E-03 8.37E-02 7.31E-02 7.62E-02 2.59E-03 8.33E-02 6.91E-02 7.32E-02 2.17E-03 7.91E-02 6.73E-02 7.48E-02 2.28E-03 8.11E-02 6.85E-02 7.54E-02 3.13E-03 8.40E-02 6.68E-02 8.84E-02 1.82E-03 9.34E-02 8.34E-02 4.00E-02 PASS 8.52E-02 1.92E-03 9.05E-02 7.99E-02 4.00E-02 PASS 8.40E-02 1.22E-03 8.74E-02 8.06E-02 4.00E-02 PASS 8.14E-02 1.14E-03 8.45E-02 7.83E-02 3.00E-02 PASS 7.74E-02 1.34E-03 8.11E-02 7.37E-02 2.00E-02 PASS 7.92E-02 1.48E-03 8.33E-02 7.51E-02 2.00E-02 PASS 8.20E-02 1.87E-03 8.71E-02 7.69E-02 2.00E-02 PASS An ISO 9001:2000 Certified Company 73 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E-01 Positive Slew Rate 2 @ +5V (V/us) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.34. Plot of Positive Slew Rate 2 @ +5V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 74 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.34. Raw data for Positive Slew Rate 2 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 2 @ +5V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.10E-02 8.50E-02 8.10E-02 8.10E-02 8.50E-02 8.90E-02 8.80E-02 8.90E-02 9.30E-02 8.60E-02 8.40E-02 10 7.80E-02 8.30E-02 7.80E-02 7.80E-02 8.20E-02 8.50E-02 8.60E-02 8.60E-02 8.90E-02 8.50E-02 8.20E-02 20 7.70E-02 8.20E-02 7.80E-02 7.70E-02 8.00E-02 8.30E-02 8.30E-02 8.30E-02 8.70E-02 8.30E-02 8.40E-02 30 7.40E-02 8.00E-02 7.50E-02 7.50E-02 7.90E-02 8.20E-02 8.20E-02 8.20E-02 8.30E-02 7.90E-02 8.30E-02 50 7.20E-02 7.50E-02 7.10E-02 7.20E-02 7.50E-02 7.80E-02 8.10E-02 7.80E-02 7.90E-02 7.80E-02 8.40E-02 60 7.30E-02 7.70E-02 7.40E-02 7.20E-02 7.70E-02 8.00E-02 8.10E-02 8.10E-02 8.10E-02 7.90E-02 8.30E-02 70 7.30E-02 7.80E-02 7.30E-02 7.40E-02 7.80E-02 8.20E-02 8.20E-02 8.10E-02 8.40E-02 8.00E-02 8.20E-02 8.26E-02 2.19E-03 8.86E-02 7.66E-02 7.98E-02 2.49E-03 8.66E-02 7.30E-02 7.88E-02 2.17E-03 8.47E-02 7.29E-02 7.66E-02 2.70E-03 8.40E-02 6.92E-02 7.30E-02 1.87E-03 7.81E-02 6.79E-02 7.46E-02 2.30E-03 8.09E-02 6.83E-02 7.52E-02 2.59E-03 8.23E-02 6.81E-02 8.90E-02 2.55E-03 9.60E-02 8.20E-02 4.00E-02 PASS 8.62E-02 1.64E-03 9.07E-02 8.17E-02 4.00E-02 PASS 8.38E-02 1.79E-03 8.87E-02 7.89E-02 4.00E-02 PASS 8.16E-02 1.52E-03 8.58E-02 7.74E-02 3.00E-02 PASS 7.88E-02 1.30E-03 8.24E-02 7.52E-02 2.00E-02 PASS 8.04E-02 8.94E-04 8.29E-02 7.79E-02 2.00E-02 PASS 8.18E-02 1.48E-03 8.59E-02 7.77E-02 2.00E-02 PASS An ISO 9001:2000 Certified Company 75 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 1 @ +5V (V/us) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.35. Plot of Negative Slew Rate 1 @ +5V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 76 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.35. Raw data for Negative Slew Rate 1 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 1 @ +5V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -4.90E-02 -5.10E-02 -4.90E-02 -4.90E-02 -5.00E-02 -5.30E-02 -5.30E-02 -5.20E-02 -5.50E-02 -5.20E-02 -5.00E-02 10 -5.00E-02 -5.00E-02 -4.80E-02 -5.00E-02 -4.90E-02 -5.00E-02 -5.40E-02 -5.20E-02 -5.70E-02 -5.00E-02 -5.00E-02 20 -4.70E-02 -4.90E-02 -4.60E-02 -4.80E-02 -5.10E-02 -5.30E-02 -5.30E-02 -5.30E-02 -5.30E-02 -5.10E-02 -5.00E-02 30 -4.60E-02 -4.90E-02 -4.60E-02 -4.60E-02 -4.90E-02 -5.10E-02 -5.40E-02 -5.00E-02 -5.20E-02 -4.90E-02 -4.90E-02 50 -4.40E-02 -4.60E-02 -4.70E-02 -4.60E-02 -4.80E-02 -5.10E-02 -5.10E-02 -4.90E-02 -5.00E-02 -5.10E-02 -5.10E-02 24 hr Anneal 168 hr Anneal 60 -4.60E-02 -5.00E-02 -4.70E-02 -4.60E-02 -4.80E-02 -5.20E-02 -5.20E-02 -5.10E-02 -5.10E-02 -4.90E-02 -5.10E-02 70 -4.70E-02 -5.40E-02 -4.90E-02 -4.50E-02 -5.10E-02 -5.10E-02 -5.10E-02 -5.30E-02 -5.10E-02 -5.00E-02 -5.10E-02 -4.96E-02 -4.94E-02 -4.82E-02 -4.72E-02 -4.62E-02 -4.74E-02 -4.92E-02 8.94E-04 8.94E-04 1.92E-03 1.64E-03 1.48E-03 1.67E-03 3.49E-03 -4.71E-02 -4.69E-02 -4.29E-02 -4.27E-02 -4.21E-02 -4.28E-02 -3.96E-02 -5.21E-02 -5.19E-02 -5.35E-02 -5.17E-02 -5.03E-02 -5.20E-02 -5.88E-02 -5.30E-02 1.22E-03 -4.96E-02 -5.64E-02 -4.00E-02 PASS -5.26E-02 2.97E-03 -4.45E-02 -6.07E-02 -4.00E-02 PASS -5.26E-02 8.94E-04 -5.01E-02 -5.51E-02 -4.00E-02 PASS -5.12E-02 1.92E-03 -4.59E-02 -5.65E-02 -3.00E-02 PASS An ISO 9001:2000 Certified Company 77 -5.04E-02 8.94E-04 -4.79E-02 -5.29E-02 -2.00E-02 PASS -5.10E-02 1.22E-03 -4.76E-02 -5.44E-02 -2.00E-02 PASS -5.12E-02 1.10E-03 -4.82E-02 -5.42E-02 -2.00E-02 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 2 @ +5V (V/us) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.36. Plot of Negative Slew Rate 2 @ +5V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 78 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.36. Raw data for Negative Slew Rate 2 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 2 @ +5V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -4.80E-02 -5.20E-02 -4.80E-02 -4.90E-02 -5.10E-02 -5.30E-02 -5.30E-02 -5.30E-02 -5.60E-02 -5.20E-02 -5.10E-02 10 -4.80E-02 -5.00E-02 -4.70E-02 -4.70E-02 -5.00E-02 -5.30E-02 -5.30E-02 -5.30E-02 -5.50E-02 -5.20E-02 -5.00E-02 20 -4.80E-02 -5.10E-02 -4.70E-02 -4.70E-02 -4.80E-02 -5.40E-02 -5.10E-02 -5.30E-02 -5.30E-02 -5.00E-02 -5.20E-02 30 -4.50E-02 -4.90E-02 -4.40E-02 -4.70E-02 -4.90E-02 -4.90E-02 -5.00E-02 -5.10E-02 -5.60E-02 -5.00E-02 -5.00E-02 50 -4.30E-02 -4.60E-02 -4.40E-02 -4.40E-02 -4.80E-02 -4.90E-02 -4.90E-02 -4.90E-02 -5.20E-02 -4.90E-02 -4.90E-02 24 hr Anneal 168 hr Anneal 60 -4.40E-02 -4.80E-02 -4.50E-02 -4.60E-02 -4.80E-02 -4.90E-02 -5.00E-02 -4.80E-02 -5.30E-02 -5.00E-02 -5.20E-02 70 -4.60E-02 -5.00E-02 -4.70E-02 -4.60E-02 -4.70E-02 -5.00E-02 -5.40E-02 -5.00E-02 -5.60E-02 -4.80E-02 -4.90E-02 -4.96E-02 -4.84E-02 -4.82E-02 -4.68E-02 -4.50E-02 -4.62E-02 -4.72E-02 1.82E-03 1.52E-03 1.64E-03 2.28E-03 2.00E-03 1.79E-03 1.64E-03 -4.46E-02 -4.42E-02 -4.37E-02 -4.05E-02 -3.95E-02 -4.13E-02 -4.27E-02 -5.46E-02 -5.26E-02 -5.27E-02 -5.31E-02 -5.05E-02 -5.11E-02 -5.17E-02 -5.34E-02 1.52E-03 -4.92E-02 -5.76E-02 -4.00E-02 PASS -5.32E-02 1.10E-03 -5.02E-02 -5.62E-02 -4.00E-02 PASS -5.22E-02 1.64E-03 -4.77E-02 -5.67E-02 -4.00E-02 PASS -5.12E-02 2.77E-03 -4.36E-02 -5.88E-02 -3.00E-02 PASS An ISO 9001:2000 Certified Company 79 -4.96E-02 1.34E-03 -4.59E-02 -5.33E-02 -2.00E-02 PASS -5.00E-02 1.87E-03 -4.49E-02 -5.51E-02 -2.00E-02 PASS -5.16E-02 3.29E-03 -4.26E-02 -6.06E-02 -2.00E-02 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @+15V (A) 2.50E-04 2.00E-04 1.50E-04 1.00E-04 5.00E-05 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.37. Plot of Positive Supply Current @+15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 80 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.37. Raw data for Positive Supply Current @+15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @+15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.80E-05 1.04E-04 9.70E-05 9.60E-05 1.00E-04 1.06E-04 1.05E-04 1.06E-04 1.10E-04 1.02E-04 1.00E-04 10 9.60E-05 1.02E-04 9.50E-05 9.40E-05 9.80E-05 1.03E-04 1.04E-04 1.03E-04 1.07E-04 1.00E-04 1.01E-04 20 9.30E-05 9.90E-05 9.30E-05 9.20E-05 9.50E-05 1.02E-04 1.00E-04 1.01E-04 1.05E-04 9.70E-05 1.00E-04 30 9.10E-05 9.70E-05 9.00E-05 9.00E-05 9.40E-05 9.80E-05 9.80E-05 9.90E-05 1.01E-04 9.40E-05 1.01E-04 50 8.70E-05 9.20E-05 8.60E-05 8.50E-05 8.70E-05 9.30E-05 9.40E-05 9.30E-05 9.40E-05 9.00E-05 1.01E-04 60 8.80E-05 9.20E-05 8.60E-05 8.60E-05 8.80E-05 9.50E-05 9.50E-05 9.30E-05 9.70E-05 9.10E-05 1.01E-04 70 8.60E-05 9.50E-05 8.60E-05 8.50E-05 8.70E-05 9.90E-05 9.90E-05 9.90E-05 1.02E-04 9.50E-05 1.01E-04 9.90E-05 3.16E-06 1.08E-04 9.03E-05 9.70E-05 3.16E-06 1.06E-04 8.83E-05 9.44E-05 2.79E-06 1.02E-04 8.67E-05 9.24E-05 3.05E-06 1.01E-04 8.40E-05 8.74E-05 2.70E-06 9.48E-05 8.00E-05 8.80E-05 2.45E-06 9.47E-05 8.13E-05 8.78E-05 4.09E-06 9.90E-05 7.66E-05 1.06E-04 2.86E-06 1.14E-04 9.79E-05 2.00E-04 PASS 1.03E-04 2.51E-06 1.10E-04 9.65E-05 2.00E-04 PASS 1.01E-04 2.92E-06 1.09E-04 9.30E-05 2.00E-04 PASS 9.80E-05 2.55E-06 1.05E-04 9.10E-05 2.00E-04 PASS 9.28E-05 1.64E-06 9.73E-05 8.83E-05 2.00E-04 PASS 9.42E-05 2.28E-06 1.00E-04 8.79E-05 2.00E-04 PASS 9.88E-05 2.49E-06 1.06E-04 9.20E-05 2.00E-04 PASS An ISO 9001:2000 Certified Company 81 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @+15V (A) 0.00E+00 -5.00E-05 -1.00E-04 -1.50E-04 -2.00E-04 -2.50E-04 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.38. Plot of Negative Supply Current @+15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 82 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.38. Raw data for Negative Supply Current @+15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @+15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -9.80E-05 -1.02E-04 -9.70E-05 -9.70E-05 -1.00E-04 -1.05E-04 -1.06E-04 -1.05E-04 -1.09E-04 -1.02E-04 -1.01E-04 10 -9.40E-05 -1.00E-04 -9.50E-05 -9.50E-05 -9.80E-05 -1.04E-04 -1.04E-04 -1.03E-04 -1.08E-04 -1.00E-04 -1.00E-04 20 -9.30E-05 -1.00E-04 -9.30E-05 -9.20E-05 -9.50E-05 -1.00E-04 -1.01E-04 -1.00E-04 -1.04E-04 -9.70E-05 -1.00E-04 30 -9.20E-05 -9.70E-05 -9.00E-05 -8.90E-05 -9.30E-05 -9.70E-05 -9.90E-05 -9.70E-05 -1.01E-04 -9.40E-05 -1.00E-04 50 -8.70E-05 -9.10E-05 -8.60E-05 -8.60E-05 -8.80E-05 -9.30E-05 -9.30E-05 -9.10E-05 -9.20E-05 -8.80E-05 -1.00E-04 60 -8.80E-05 -9.10E-05 -8.60E-05 -8.70E-05 -8.90E-05 -9.50E-05 -9.40E-05 -9.20E-05 -9.50E-05 -9.00E-05 -1.01E-04 70 -8.60E-05 -9.40E-05 -8.50E-05 -8.40E-05 -8.80E-05 -9.80E-05 -9.80E-05 -9.80E-05 -1.02E-04 -9.30E-05 -1.00E-04 -9.88E-05 2.17E-06 -9.29E-05 -1.05E-04 -9.64E-05 2.51E-06 -8.95E-05 -1.03E-04 -9.46E-05 3.21E-06 -8.58E-05 -1.03E-04 -9.22E-05 3.11E-06 -8.37E-05 -1.01E-04 -8.76E-05 2.07E-06 -8.19E-05 -9.33E-05 -8.82E-05 1.92E-06 -8.29E-05 -9.35E-05 -8.74E-05 3.97E-06 -7.65E-05 -9.83E-05 -1.05E-04 2.51E-06 -9.85E-05 -1.12E-04 -2.00E-04 PASS -1.04E-04 2.86E-06 -9.59E-05 -1.12E-04 -2.00E-04 PASS -1.00E-04 2.51E-06 -9.35E-05 -1.07E-04 -2.00E-04 PASS -9.76E-05 2.61E-06 -9.04E-05 -1.05E-04 -2.00E-04 PASS -9.14E-05 2.07E-06 -8.57E-05 -9.71E-05 -2.00E-04 PASS -9.32E-05 2.17E-06 -8.73E-05 -9.91E-05 -2.00E-04 PASS -9.78E-05 3.19E-06 -8.90E-05 -1.07E-04 -2.00E-04 PASS An ISO 9001:2000 Certified Company 83 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 1 @ +15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.39. Plot of Input Offset Voltage 1 @ +15V (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 84 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.39. Raw data for Input Offset Voltage 1 @ +15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 @ +15V (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.05E-06 -2.86E-05 -3.37E-05 -1.32E-05 9.10E-06 6.24E-05 -3.71E-06 3.46E-05 -4.67E-06 -1.90E-06 1.09E-05 10 -2.16E-05 -5.39E-05 -6.51E-05 -3.88E-05 -1.91E-05 4.71E-05 -2.11E-05 2.34E-05 -2.60E-05 -1.91E-05 9.06E-06 20 -1.92E-05 -5.31E-05 -6.91E-05 -3.65E-05 -2.40E-05 4.01E-05 -2.79E-05 1.43E-05 -4.29E-05 -2.69E-05 8.70E-06 30 -1.61E-05 -4.12E-05 -6.22E-05 -3.54E-05 -2.11E-05 2.95E-05 -3.48E-05 1.03E-05 -5.86E-05 -3.73E-05 7.01E-06 50 -1.12E-05 -4.70E-05 -6.00E-05 -3.56E-05 -1.76E-05 2.61E-05 -4.06E-05 -1.69E-06 -8.41E-05 -4.71E-05 7.61E-06 60 1.00E-05 -2.67E-05 -4.42E-05 -1.04E-05 3.24E-06 3.55E-05 -3.15E-05 8.43E-06 -6.44E-05 -3.56E-05 6.98E-06 70 9.46E-05 -2.15E-05 -2.45E-05 -8.09E-06 2.27E-05 4.78E-05 -9.42E-06 3.37E-05 -2.46E-05 -2.28E-05 7.12E-06 -1.35E-05 1.80E-05 3.59E-05 -6.29E-05 -3.97E-05 2.00E-05 1.51E-05 -9.45E-05 -4.04E-05 2.07E-05 1.64E-05 -9.72E-05 -3.52E-05 1.82E-05 1.48E-05 -8.52E-05 -3.43E-05 2.02E-05 2.11E-05 -8.97E-05 -1.36E-05 2.21E-05 4.71E-05 -7.43E-05 1.26E-05 4.95E-05 1.48E-04 -1.23E-04 1.73E-05 3.01E-05 9.98E-05 -6.52E-05 -3.50E-04 PASS 3.50E-04 PASS 8.72E-07 3.26E-05 9.02E-05 -8.85E-05 -3.50E-04 PASS 3.50E-04 PASS -8.67E-06 3.46E-05 8.61E-05 -1.03E-04 -3.50E-04 PASS 3.50E-04 PASS -1.82E-05 3.66E-05 8.21E-05 -1.18E-04 -5.00E-04 PASS 5.00E-04 PASS -2.95E-05 4.26E-05 8.74E-05 -1.46E-04 -6.50E-04 PASS 6.50E-04 PASS -1.75E-05 3.94E-05 9.04E-05 -1.25E-04 -6.50E-04 PASS 6.50E-04 PASS 4.93E-06 3.36E-05 9.71E-05 -8.72E-05 -6.50E-04 PASS 6.50E-04 PASS An ISO 9001:2000 Certified Company 85 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 2 @ +15V (V) 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 -8.00E-04 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.40. Plot of Input Offset Voltage 2 @ +15V (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 86 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.40. Raw data for Input Offset Voltage 2 @ +15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 2 @ +15V (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -8.95E-05 -6.20E-05 -1.82E-05 5.13E-05 4.36E-05 7.41E-06 7.53E-06 -2.69E-05 1.36E-05 4.17E-05 -1.81E-05 10 1.17E-04 -8.91E-05 -4.95E-05 2.03E-05 9.42E-06 -1.30E-05 -1.46E-05 -4.59E-05 -2.69E-05 1.70E-05 -2.26E-05 20 1.15E-04 -8.65E-05 -4.69E-05 1.92E-05 6.64E-06 -2.34E-05 -2.60E-05 -5.27E-05 -5.47E-05 8.70E-06 -2.38E-05 30 1.12E-04 -8.71E-05 -4.47E-05 2.36E-05 1.05E-05 -2.81E-05 -3.36E-05 -6.05E-05 -8.30E-05 -1.69E-06 -2.38E-05 50 1.01E-04 -8.14E-05 -6.64E-05 2.51E-05 7.73E-06 -3.74E-05 -4.41E-05 -6.69E-05 1.36E-04 -1.40E-05 -2.35E-05 60 -8.54E-05 -6.73E-05 -4.00E-05 4.27E-05 3.58E-05 -2.39E-05 -3.55E-05 -6.20E-05 1.10E-04 -4.12E-06 -2.54E-05 70 8.74E-05 1.06E-05 -2.15E-05 4.37E-05 4.24E-05 -1.38E-05 -2.25E-05 -5.92E-05 -5.12E-05 1.01E-05 -2.77E-05 -1.50E-05 6.24E-05 1.56E-04 -1.86E-04 1.64E-06 7.84E-05 2.17E-04 -2.13E-04 1.42E-06 7.62E-05 2.10E-04 -2.07E-04 2.83E-06 7.53E-05 2.09E-04 -2.04E-04 -2.71E-06 7.41E-05 2.01E-04 -2.06E-04 -2.28E-05 5.90E-05 1.39E-04 -1.85E-04 3.25E-05 4.07E-05 1.44E-04 -7.91E-05 8.66E-06 2.44E-05 7.56E-05 -5.83E-05 -3.50E-04 PASS 3.50E-04 PASS -1.67E-05 2.30E-05 4.63E-05 -7.97E-05 -3.50E-04 PASS 3.50E-04 PASS -2.96E-05 2.59E-05 4.14E-05 -1.01E-04 -3.50E-04 PASS 3.50E-04 PASS -4.14E-05 3.13E-05 4.43E-05 -1.27E-04 -5.00E-04 PASS 5.00E-04 PASS -5.26E-06 8.12E-05 2.18E-04 -2.28E-04 -6.50E-04 PASS 6.50E-04 PASS -3.08E-06 6.66E-05 1.80E-04 -1.86E-04 -6.50E-04 PASS 6.50E-04 PASS -2.73E-05 2.83E-05 5.02E-05 -1.05E-04 -6.50E-04 PASS 6.50E-04 PASS An ISO 9001:2000 Certified Company 87 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.41. Raw data for Input Offset Current 1 @ +15V (A) versus total dose, including the Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased statistical analysis, specification and the status of the testing (pass/fail). Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Specification MIN Specification MAX Ps90%/90% (+KTL) Un-Biased Input Offset Current 1 @ +15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.41. Plot of Input Offset Current 1 @ +15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 88 70 RLAT Report 08-128 090621 R1.0 Total Dose (krad(Si)) Input Offset Current 1 @ +15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 24 hr Anneal 168 hr Anneal 0 -1.10E-10 -1.10E-10 0.00E+00 -1.10E-10 0.00E+00 -6.00E-11 -1.50E-10 -6.00E-11 -7.00E-11 2.00E-11 -1.60E-10 10 -3.00E-11 -8.00E-11 4.00E-11 -9.00E-11 -4.00E-11 -9.00E-11 -1.90E-10 -6.00E-11 -9.00E-11 -5.00E-11 -2.10E-10 20 -8.00E-11 -1.00E-10 -5.00E-11 -6.00E-11 0.00E+00 -1.00E-10 -1.70E-10 -6.00E-11 -8.00E-11 -6.00E-11 -1.60E-10 30 -2.00E-11 -3.00E-11 -1.20E-10 -1.70E-10 1.70E-10 -1.70E-10 -4.00E-11 -6.00E-11 -1.30E-10 -4.00E-11 -1.90E-10 50 -1.00E-10 -8.00E-11 -2.90E-10 -1.50E-10 -6.00E-11 -2.60E-10 -1.10E-10 -1.50E-10 -1.00E-10 -2.00E-11 -2.10E-10 60 -5.00E-11 -1.20E-10 -5.90E-10 -3.00E-11 -2.90E-10 -1.80E-10 -1.10E-10 -1.90E-10 -1.40E-10 1.20E-10 -1.90E-10 70 4.47E-09 1.10E-10 3.60E-10 -2.20E-10 6.10E-10 -1.30E-10 -9.00E-11 -1.00E-11 -1.50E-10 6.00E-11 -1.60E-10 -6.60E-11 6.02E-11 9.92E-11 -2.31E-10 -4.00E-11 5.15E-11 1.01E-10 -1.81E-10 -5.80E-11 3.77E-11 4.53E-11 -1.61E-10 -3.40E-11 1.30E-10 3.23E-10 -3.91E-10 -1.36E-10 9.24E-11 1.17E-10 -3.89E-10 -2.16E-10 2.33E-10 4.22E-10 -8.54E-10 1.07E-09 1.93E-09 6.35E-09 -4.22E-09 -6.40E-11 6.02E-11 1.01E-10 -2.29E-10 -8.00E-10 PASS 8.00E-10 PASS -9.60E-11 5.55E-11 5.62E-11 -2.48E-10 -2.00E-09 PASS 2.00E-09 PASS -9.40E-11 4.56E-11 3.11E-11 -2.19E-10 -2.00E-09 PASS 2.00E-09 PASS -8.80E-11 5.89E-11 7.35E-11 -2.50E-10 -8.00E-09 PASS 8.00E-09 PASS -1.28E-10 8.76E-11 1.12E-10 -3.68E-10 -1.30E-08 PASS 1.30E-08 PASS -1.00E-10 1.27E-10 2.48E-10 -4.48E-10 -1.30E-08 PASS 1.30E-08 PASS -6.40E-11 8.76E-11 1.76E-10 -3.04E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2000 Certified Company 89 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 2 @ +15V (A) 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.42. Plot of Input Offset Current 2 @ +15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 90 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.42. Raw data for Input Offset Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 @ +15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.00E-11 -6.00E-11 -6.00E-11 -1.40E-10 -1.00E-10 -1.60E-10 -9.00E-11 -5.00E-11 -1.70E-10 -1.10E-10 -7.00E-11 10 5.00E-11 -1.00E-10 -1.00E-10 -1.90E-10 -8.00E-11 -7.00E-11 -9.00E-11 -2.00E-11 -2.40E-10 -5.00E-11 -6.00E-11 20 5.00E-11 -1.40E-10 -1.00E-10 -1.50E-10 -1.10E-10 -1.00E-10 -1.00E-11 2.00E-11 -1.40E-10 1.00E-11 -3.00E-11 30 2.00E-11 2.00E-11 -5.00E-11 -2.20E-10 -5.00E-11 -7.00E-11 -2.00E-11 1.40E-10 -2.50E-10 -2.00E-11 -4.00E-11 50 -3.00E-11 -2.00E-11 -4.00E-11 -3.20E-10 -3.60E-10 -7.00E-11 -9.00E-11 2.30E-10 -3.40E-10 -7.00E-11 -5.00E-11 60 6.00E-11 5.00E-11 3.00E-11 -2.10E-10 -9.00E-11 9.00E-11 7.00E-11 3.50E-10 2.00E-11 1.00E-10 -2.00E-11 70 5.82E-09 4.54E-09 -4.30E-10 -3.20E-10 -3.30E-10 2.00E-11 -1.40E-10 1.20E-10 -1.70E-10 -6.00E-11 -4.00E-11 -5.60E-11 8.29E-11 1.71E-10 -2.83E-10 -8.40E-11 8.62E-11 1.52E-10 -3.20E-10 -9.00E-11 8.09E-11 1.32E-10 -3.12E-10 -5.60E-11 9.81E-11 2.13E-10 -3.25E-10 -1.54E-10 1.71E-10 3.14E-10 -6.22E-10 -3.20E-11 1.16E-10 2.87E-10 -3.51E-10 1.86E-09 3.07E-09 1.03E-08 -6.56E-09 -1.16E-10 4.98E-11 2.06E-11 -2.53E-10 -8.00E-10 PASS 8.00E-10 PASS -9.40E-11 8.56E-11 1.41E-10 -3.29E-10 -2.00E-09 PASS 2.00E-09 PASS -4.40E-11 7.16E-11 1.52E-10 -2.40E-10 -2.00E-09 PASS 2.00E-09 PASS -4.40E-11 1.40E-10 3.39E-10 -4.27E-10 -8.00E-09 PASS 8.00E-09 PASS -6.80E-11 2.02E-10 4.86E-10 -6.22E-10 -1.30E-08 PASS 1.30E-08 PASS 1.26E-10 1.29E-10 4.80E-10 -2.28E-10 -1.30E-08 PASS 1.30E-08 PASS -4.60E-11 1.19E-10 2.79E-10 -3.71E-10 -1.30E-08 PASS 1.30E-08 PASS An ISO 9001:2000 Certified Company 91 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 1 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.43. Plot of Positive Input Bias Current 1 @ +15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 92 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.43. Raw data for Positive Input Bias Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 1 @ +15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.00E-09 8.21E-09 8.43E-09 8.15E-09 7.81E-09 7.68E-09 7.96E-09 7.67E-09 7.43E-09 8.22E-09 8.28E-09 10 9.10E-09 9.39E-09 9.75E-09 9.24E-09 8.97E-09 8.86E-09 9.08E-09 8.89E-09 8.61E-09 9.44E-09 8.33E-09 20 1.08E-08 1.11E-08 1.13E-08 1.08E-08 1.07E-08 1.06E-08 1.09E-08 1.07E-08 1.03E-08 1.12E-08 8.35E-09 30 1.26E-08 1.30E-08 1.30E-08 1.25E-08 1.25E-08 1.23E-08 1.26E-08 1.23E-08 1.20E-08 1.31E-08 8.28E-09 50 1.61E-08 1.66E-08 1.67E-08 1.63E-08 1.61E-08 1.57E-08 1.62E-08 1.61E-08 1.56E-08 1.69E-08 8.34E-09 60 1.80E-08 1.84E-08 1.84E-08 1.80E-08 1.76E-08 1.62E-08 1.66E-08 1.64E-08 1.60E-08 1.71E-08 8.30E-09 70 2.04E-08 1.78E-08 2.01E-08 1.95E-08 1.88E-08 1.48E-08 1.50E-08 1.50E-08 1.44E-08 1.54E-08 8.26E-09 8.12E-09 2.32E-10 8.76E-09 7.48E-09 9.29E-09 3.01E-10 1.01E-08 8.46E-09 1.10E-08 2.59E-10 1.17E-08 1.02E-08 1.27E-08 2.56E-10 1.34E-08 1.20E-08 1.64E-08 2.82E-10 1.71E-08 1.56E-08 1.81E-08 3.20E-10 1.90E-08 1.72E-08 1.93E-08 1.02E-09 2.21E-08 1.65E-08 7.79E-09 3.04E-10 8.63E-09 6.96E-09 -1.50E-08 PASS 1.50E-08 PASS 8.98E-09 3.09E-10 9.82E-09 8.13E-09 -2.00E-08 PASS 2.00E-08 PASS 1.07E-08 3.34E-10 1.16E-08 9.81E-09 -2.00E-08 PASS 2.00E-08 PASS 1.25E-08 4.30E-10 1.37E-08 1.13E-08 -4.00E-08 PASS 4.00E-08 PASS 1.61E-08 5.22E-10 1.75E-08 1.47E-08 -8.00E-08 PASS 8.00E-08 PASS 1.65E-08 4.22E-10 1.76E-08 1.53E-08 -8.00E-08 PASS 8.00E-08 PASS 1.49E-08 3.62E-10 1.59E-08 1.39E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 93 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 2 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.44. Plot of Positive Input Bias Current 2 @ +15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 94 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.44. Raw data for Positive Input Bias Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 2 @ +15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.12E-09 8.22E-09 8.29E-09 8.05E-09 7.70E-09 7.87E-09 8.04E-09 7.71E-09 7.40E-09 8.18E-09 8.34E-09 10 9.26E-09 9.42E-09 9.54E-09 9.16E-09 8.87E-09 9.14E-09 9.16E-09 8.99E-09 8.69E-09 9.52E-09 8.41E-09 20 1.10E-08 1.11E-08 1.11E-08 1.08E-08 1.06E-08 1.09E-08 1.10E-08 1.08E-08 1.05E-08 1.13E-08 8.38E-09 30 1.28E-08 1.29E-08 1.30E-08 1.26E-08 1.23E-08 1.27E-08 1.28E-08 1.25E-08 1.23E-08 1.32E-08 8.37E-09 50 1.64E-08 1.66E-08 1.67E-08 1.63E-08 1.58E-08 1.63E-08 1.63E-08 1.65E-08 1.62E-08 1.69E-08 8.40E-09 60 1.82E-08 1.84E-08 1.84E-08 1.81E-08 1.74E-08 1.70E-08 1.69E-08 1.69E-08 1.69E-08 1.73E-08 8.41E-09 70 2.09E-08 1.96E-08 1.99E-08 1.95E-08 1.83E-08 1.53E-08 1.51E-08 1.51E-08 1.52E-08 1.54E-08 8.31E-09 8.08E-09 2.29E-10 8.71E-09 7.45E-09 9.25E-09 2.58E-10 9.96E-09 8.54E-09 1.09E-08 2.32E-10 1.15E-08 1.03E-08 1.27E-08 2.80E-10 1.35E-08 1.20E-08 1.63E-08 3.71E-10 1.74E-08 1.53E-08 1.81E-08 3.91E-10 1.92E-08 1.70E-08 1.97E-08 9.34E-10 2.22E-08 1.71E-08 7.84E-09 3.03E-10 8.67E-09 7.01E-09 -1.50E-08 PASS 1.50E-08 PASS 9.10E-09 3.01E-10 9.92E-09 8.28E-09 -2.00E-08 PASS 2.00E-08 PASS 1.09E-08 2.90E-10 1.17E-08 1.01E-08 -2.00E-08 PASS 2.00E-08 PASS 1.27E-08 3.25E-10 1.36E-08 1.18E-08 -4.00E-08 PASS 4.00E-08 PASS 1.64E-08 2.72E-10 1.72E-08 1.57E-08 -8.00E-08 PASS 8.00E-08 PASS 1.70E-08 1.98E-10 1.75E-08 1.64E-08 -8.00E-08 PASS 8.00E-08 PASS 1.52E-08 1.31E-10 1.56E-08 1.49E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 95 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 1 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.45. Plot of Negative Input Bias Current 1 @ +15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 96 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.45. Raw data for Negative Input Bias Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 1 @ +15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.15E-09 8.33E-09 8.44E-09 8.22E-09 7.84E-09 7.77E-09 8.14E-09 7.78E-09 7.53E-09 8.20E-09 8.46E-09 10 9.20E-09 9.50E-09 9.74E-09 9.36E-09 9.00E-09 9.04E-09 9.32E-09 8.96E-09 8.77E-09 9.57E-09 8.51E-09 20 1.09E-08 1.12E-08 1.13E-08 1.09E-08 1.08E-08 1.08E-08 1.11E-08 1.08E-08 1.04E-08 1.13E-08 8.48E-09 30 1.26E-08 1.30E-08 1.32E-08 1.27E-08 1.23E-08 1.24E-08 1.27E-08 1.23E-08 1.22E-08 1.32E-08 8.49E-09 50 1.62E-08 1.67E-08 1.71E-08 1.65E-08 1.62E-08 1.60E-08 1.64E-08 1.64E-08 1.58E-08 1.69E-08 8.51E-09 60 1.81E-08 1.85E-08 1.91E-08 1.81E-08 1.79E-08 1.66E-08 1.68E-08 1.67E-08 1.62E-08 1.70E-08 8.50E-09 70 1.59E-08 1.78E-08 1.98E-08 1.98E-08 1.83E-08 1.50E-08 1.51E-08 1.50E-08 1.46E-08 1.54E-08 8.43E-09 8.20E-09 2.27E-10 8.82E-09 7.57E-09 9.36E-09 2.82E-10 1.01E-08 8.59E-09 1.10E-08 2.55E-10 1.17E-08 1.03E-08 1.28E-08 3.33E-10 1.37E-08 1.19E-08 1.65E-08 3.46E-10 1.75E-08 1.56E-08 1.84E-08 4.77E-10 1.97E-08 1.71E-08 1.83E-08 1.61E-09 2.27E-08 1.39E-08 7.88E-09 2.80E-10 8.65E-09 7.12E-09 -1.50E-08 PASS 1.50E-08 PASS 9.13E-09 3.15E-10 1.00E-08 8.27E-09 -2.00E-08 PASS 2.00E-08 PASS 1.09E-08 3.33E-10 1.18E-08 9.95E-09 -2.00E-08 PASS 2.00E-08 PASS 1.26E-08 4.27E-10 1.37E-08 1.14E-08 -4.00E-08 PASS 4.00E-08 PASS 1.63E-08 4.33E-10 1.75E-08 1.51E-08 -8.00E-08 PASS 8.00E-08 PASS 1.66E-08 3.18E-10 1.75E-08 1.58E-08 -8.00E-08 PASS 8.00E-08 PASS 1.50E-08 2.66E-10 1.57E-08 1.43E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 97 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 2 @ +15V (A) 1.00E-07 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 -1.00E-07 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.46. Plot of Negative Input Bias Current 2 @ +15V (A) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 98 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.46. Raw data for Negative Input Bias Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 2 @ +15V (A) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 8.08E-09 8.28E-09 8.37E-09 8.20E-09 7.82E-09 8.00E-09 8.14E-09 7.77E-09 7.57E-09 8.30E-09 8.39E-09 10 9.20E-09 9.49E-09 9.69E-09 9.33E-09 8.98E-09 9.25E-09 9.35E-09 9.01E-09 8.92E-09 9.61E-09 8.46E-09 20 1.10E-08 1.13E-08 1.12E-08 1.10E-08 1.07E-08 1.11E-08 1.10E-08 1.08E-08 1.07E-08 1.13E-08 8.47E-09 30 1.28E-08 1.30E-08 1.30E-08 1.28E-08 1.24E-08 1.28E-08 1.28E-08 1.24E-08 1.25E-08 1.33E-08 8.44E-09 50 1.65E-08 1.67E-08 1.68E-08 1.66E-08 1.62E-08 1.64E-08 1.64E-08 1.63E-08 1.66E-08 1.71E-08 8.46E-09 60 1.82E-08 1.84E-08 1.85E-08 1.83E-08 1.76E-08 1.69E-08 1.69E-08 1.66E-08 1.69E-08 1.73E-08 8.43E-09 70 1.52E-08 1.51E-08 2.04E-08 1.98E-08 1.87E-08 1.53E-08 1.53E-08 1.50E-08 1.53E-08 1.56E-08 8.40E-09 8.15E-09 2.13E-10 8.73E-09 7.57E-09 9.34E-09 2.71E-10 1.01E-08 8.59E-09 1.10E-08 2.39E-10 1.17E-08 1.04E-08 1.28E-08 2.60E-10 1.35E-08 1.21E-08 1.65E-08 2.27E-10 1.72E-08 1.59E-08 1.82E-08 3.44E-10 1.91E-08 1.73E-08 1.78E-08 2.53E-09 2.48E-08 1.09E-08 7.96E-09 2.91E-10 8.75E-09 7.16E-09 -1.50E-08 PASS 1.50E-08 PASS 9.23E-09 2.76E-10 9.98E-09 8.47E-09 -2.00E-08 PASS 2.00E-08 PASS 1.10E-08 2.26E-10 1.16E-08 1.04E-08 -2.00E-08 PASS 2.00E-08 PASS 1.28E-08 3.19E-10 1.36E-08 1.19E-08 -4.00E-08 PASS 4.00E-08 PASS 1.65E-08 3.19E-10 1.74E-08 1.57E-08 -8.00E-08 PASS 8.00E-08 PASS 1.69E-08 2.38E-10 1.76E-08 1.63E-08 -8.00E-08 PASS 8.00E-08 PASS 1.53E-08 1.89E-10 1.58E-08 1.48E-08 -8.00E-08 PASS 8.00E-08 PASS An ISO 9001:2000 Certified Company 99 Common Mode Rejection Ratio 1 @ +15V (dB) RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.47. Plot of Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 100 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.47. Raw data for Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 @ +15V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.08E+02 1.10E+02 1.08E+02 1.10E+02 1.11E+02 1.15E+02 1.11E+02 1.09E+02 1.08E+02 1.14E+02 1.09E+02 10 1.08E+02 1.09E+02 1.07E+02 1.09E+02 1.10E+02 1.14E+02 1.10E+02 1.09E+02 1.08E+02 1.13E+02 1.09E+02 20 1.07E+02 1.09E+02 1.07E+02 1.08E+02 1.10E+02 1.12E+02 1.09E+02 1.08E+02 1.07E+02 1.11E+02 1.09E+02 30 1.07E+02 1.09E+02 1.06E+02 1.08E+02 1.09E+02 1.11E+02 1.08E+02 1.07E+02 1.06E+02 1.11E+02 1.09E+02 50 1.06E+02 1.07E+02 1.07E+02 1.07E+02 1.10E+02 1.10E+02 1.08E+02 1.06E+02 1.05E+02 1.09E+02 1.10E+02 60 1.07E+02 1.08E+02 1.07E+02 1.08E+02 1.10E+02 1.11E+02 1.08E+02 1.07E+02 1.05E+02 1.10E+02 1.09E+02 70 1.07E+02 1.09E+02 1.06E+02 1.08E+02 1.09E+02 1.13E+02 1.10E+02 1.08E+02 1.07E+02 1.11E+02 1.09E+02 1.10E+02 1.34E+00 1.13E+02 1.06E+02 1.09E+02 1.28E+00 1.12E+02 1.05E+02 1.08E+02 1.10E+00 1.11E+02 1.05E+02 1.08E+02 1.27E+00 1.11E+02 1.04E+02 1.07E+02 1.54E+00 1.12E+02 1.03E+02 1.08E+02 1.32E+00 1.12E+02 1.05E+02 1.08E+02 1.41E+00 1.12E+02 1.04E+02 1.12E+02 3.08E+00 1.20E+02 1.03E+02 9.70E+01 PASS 1.10E+02 2.68E+00 1.18E+02 1.03E+02 9.40E+01 PASS 1.09E+02 2.25E+00 1.16E+02 1.03E+02 9.40E+01 PASS 1.09E+02 2.33E+00 1.15E+02 1.02E+02 9.20E+01 PASS 1.07E+02 2.09E+00 1.13E+02 1.02E+02 9.00E+01 PASS 1.08E+02 2.33E+00 1.15E+02 1.02E+02 9.00E+01 PASS 1.10E+02 2.43E+00 1.17E+02 1.03E+02 9.00E+01 PASS An ISO 9001:2000 Certified Company 101 Common Mode Rejection Ratio 2 @ +15V (dB) RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.48. Plot of Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 102 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.48. Raw data for Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 @ +15V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.06E+02 1.11E+02 1.09E+02 1.12E+02 1.19E+02 1.08E+02 1.08E+02 1.07E+02 1.07E+02 1.08E+02 1.08E+02 10 1.06E+02 1.10E+02 1.08E+02 1.10E+02 1.17E+02 1.08E+02 1.07E+02 1.06E+02 1.06E+02 1.07E+02 1.08E+02 20 1.05E+02 1.10E+02 1.08E+02 1.10E+02 1.15E+02 1.07E+02 1.07E+02 1.06E+02 1.05E+02 1.06E+02 1.08E+02 30 1.05E+02 1.11E+02 1.07E+02 1.09E+02 1.15E+02 1.06E+02 1.06E+02 1.05E+02 1.04E+02 1.06E+02 1.08E+02 50 1.05E+02 1.09E+02 1.08E+02 1.09E+02 1.13E+02 1.06E+02 1.05E+02 1.04E+02 1.03E+02 1.05E+02 1.09E+02 60 1.05E+02 1.10E+02 1.08E+02 1.10E+02 1.16E+02 1.06E+02 1.06E+02 1.05E+02 1.04E+02 1.05E+02 1.08E+02 70 1.07E+02 1.10E+02 1.07E+02 1.10E+02 1.18E+02 1.07E+02 1.07E+02 1.06E+02 1.05E+02 1.07E+02 1.09E+02 1.12E+02 4.77E+00 1.25E+02 9.85E+01 1.10E+02 4.35E+00 1.22E+02 9.83E+01 1.10E+02 3.72E+00 1.20E+02 9.95E+01 1.09E+02 3.63E+00 1.19E+02 9.93E+01 1.09E+02 3.13E+00 1.17E+02 1.00E+02 1.10E+02 3.90E+00 1.20E+02 9.90E+01 1.11E+02 4.22E+00 1.22E+02 9.90E+01 1.08E+02 6.42E-01 1.09E+02 1.06E+02 9.70E+01 PASS 1.07E+02 8.25E-01 1.09E+02 1.04E+02 9.40E+01 PASS 1.06E+02 8.62E-01 1.08E+02 1.04E+02 9.40E+01 PASS 1.05E+02 9.20E-01 1.08E+02 1.03E+02 9.20E+01 PASS 1.05E+02 9.99E-01 1.07E+02 1.02E+02 9.00E+01 PASS 1.05E+02 9.11E-01 1.08E+02 1.03E+02 9.00E+01 PASS 1.06E+02 7.65E-01 1.08E+02 1.04E+02 9.00E+01 PASS An ISO 9001:2000 Certified Company 103 Power Supply Rejection Ratio 1 @ +15V (dB) RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.49. Plot of Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 104 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.49. Raw data for Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 1 @ +15V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.25E+02 1.46E+02 1.28E+02 1.26E+02 1.37E+02 1.20E+02 1.37E+02 1.29E+02 1.28E+02 1.26E+02 1.31E+02 10 1.28E+02 1.41E+02 1.26E+02 1.27E+02 1.30E+02 1.20E+02 1.42E+02 1.29E+02 1.27E+02 1.25E+02 1.31E+02 20 1.25E+02 1.50E+02 1.26E+02 1.25E+02 1.29E+02 1.20E+02 1.37E+02 1.31E+02 1.26E+02 1.27E+02 1.30E+02 30 1.25E+02 1.35E+02 1.28E+02 1.26E+02 1.28E+02 1.20E+02 1.46E+02 1.33E+02 1.23E+02 1.27E+02 1.32E+02 50 1.24E+02 1.40E+02 1.36E+02 1.24E+02 1.43E+02 1.21E+02 1.41E+02 1.36E+02 1.23E+02 1.32E+02 1.31E+02 60 1.23E+02 1.40E+02 1.32E+02 1.24E+02 1.32E+02 1.20E+02 1.50E+02 1.34E+02 1.23E+02 1.29E+02 1.35E+02 70 1.19E+02 1.39E+02 1.23E+02 1.25E+02 1.25E+02 1.21E+02 1.43E+02 1.31E+02 1.25E+02 1.27E+02 1.31E+02 1.32E+02 8.85E+00 1.57E+02 1.08E+02 1.30E+02 6.04E+00 1.47E+02 1.14E+02 1.31E+02 1.08E+01 1.61E+02 1.01E+02 1.28E+02 4.02E+00 1.40E+02 1.17E+02 1.33E+02 8.84E+00 1.58E+02 1.09E+02 1.30E+02 6.87E+00 1.49E+02 1.11E+02 1.26E+02 7.60E+00 1.47E+02 1.05E+02 1.28E+02 6.38E+00 1.46E+02 1.11E+02 1.00E+02 PASS 1.29E+02 8.15E+00 1.51E+02 1.06E+02 1.00E+02 PASS 1.28E+02 6.13E+00 1.45E+02 1.11E+02 1.00E+02 PASS 1.30E+02 1.02E+01 1.58E+02 1.02E+02 1.00E+02 PASS 1.31E+02 8.50E+00 1.54E+02 1.07E+02 9.80E+01 PASS 1.31E+02 1.18E+01 1.64E+02 9.88E+01 9.80E+01 PASS 1.29E+02 8.14E+00 1.52E+02 1.07E+02 9.80E+01 PASS An ISO 9001:2000 Certified Company 105 Power Supply Rejection Ratio 2 @ +15V (dB) RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.50. Plot of Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 106 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.50. Raw data for Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 2 @ +15V (dB) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.18E+02 1.67E+02 1.22E+02 1.40E+02 1.17E+02 1.41E+02 1.33E+02 1.22E+02 1.45E+02 1.37E+02 1.27E+02 10 1.17E+02 1.43E+02 1.22E+02 1.43E+02 1.18E+02 1.36E+02 1.37E+02 1.21E+02 1.50E+02 1.55E+02 1.28E+02 20 1.17E+02 1.41E+02 1.22E+02 1.43E+02 1.18E+02 1.39E+02 1.35E+02 1.22E+02 1.55E+02 1.52E+02 1.28E+02 30 1.16E+02 1.49E+02 1.22E+02 1.47E+02 1.19E+02 1.43E+02 1.37E+02 1.20E+02 1.34E+02 1.38E+02 1.28E+02 50 1.16E+02 1.40E+02 1.28E+02 1.54E+02 1.20E+02 1.53E+02 1.57E+02 1.19E+02 1.31E+02 1.38E+02 1.27E+02 60 1.16E+02 1.32E+02 1.24E+02 1.59E+02 1.19E+02 1.46E+02 1.45E+02 1.19E+02 1.34E+02 1.45E+02 1.28E+02 70 1.16E+02 1.26E+02 1.20E+02 1.43E+02 1.18E+02 1.42E+02 1.33E+02 1.19E+02 1.46E+02 1.48E+02 1.27E+02 1.33E+02 2.13E+01 1.91E+02 7.44E+01 1.29E+02 1.33E+01 1.65E+02 9.21E+01 1.28E+02 1.27E+01 1.63E+02 9.34E+01 1.30E+02 1.58E+01 1.74E+02 8.73E+01 1.32E+02 1.55E+01 1.74E+02 8.90E+01 1.30E+02 1.72E+01 1.77E+02 8.28E+01 1.25E+02 1.12E+01 1.55E+02 9.38E+01 1.36E+02 8.96E+00 1.60E+02 1.11E+02 1.00E+02 FAIL 1.40E+02 1.31E+01 1.76E+02 1.04E+02 1.00E+02 FAIL 1.41E+02 1.33E+01 1.77E+02 1.04E+02 1.00E+02 FAIL 1.35E+02 8.84E+00 1.59E+02 1.10E+02 1.00E+02 FAIL 1.40E+02 1.56E+01 1.83E+02 9.68E+01 9.80E+01 FAIL 1.38E+02 1.15E+01 1.69E+02 1.07E+02 9.80E+01 FAIL 1.38E+02 1.19E+01 1.70E+02 1.05E+02 9.80E+01 FAIL An ISO 9001:2000 Certified Company 107 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) 4.50E+04 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.51. Plot of Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show substantial degradation with radiation, however it is not sufficient for any of the individual units to exceed the post-irradiation test limits. Note that the KTL values are out of specification pre-irradiation and throughout the measurement. As discussed in the text of this report we attribute this to the large standard deviation within the sample population caused by the sensitivity of the measurement to input conditions. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in An ISO 9001:2000 Certified Company 108 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.51. Raw data for Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.94E+04 3.52E+04 3.75E+04 4.83E+04 3.42E+04 3.25E+04 4.08E+04 5.65E+04 3.10E+04 4.83E+04 5.82E+04 10 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 20 9.59E+03 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 30 8.35E+03 1.00E+04 1.00E+04 1.00E+04 8.40E+03 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 50 4.91E+03 4.68E+03 8.24E+03 5.18E+03 3.52E+03 8.19E+03 5.89E+03 6.67E+03 5.32E+03 6.49E+03 1.00E+04 60 5.68E+03 6.22E+03 6.62E+03 6.69E+03 4.38E+03 9.55E+03 1.00E+04 8.01E+03 7.88E+03 5.75E+03 1.00E+04 70 7.51E+03 9.73E+03 1.00E+04 8.24E+03 6.30E+03 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 3.89E+04 5.61E+03 5.43E+04 2.35E+04 1.00E+04 0.00E+00 1.00E+04 1.00E+04 9.92E+03 1.85E+02 1.04E+04 9.41E+03 9.35E+03 8.89E+02 1.18E+04 6.91E+03 5.31E+03 1.76E+03 1.01E+04 4.83E+02 5.92E+03 9.48E+02 8.51E+03 3.32E+03 8.36E+03 1.55E+03 1.26E+04 4.11E+03 4.18E+04 1.07E+04 7.12E+04 1.24E+04 1.00E+03 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 1.00E+03 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 1.00E+03 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 7.00E+02 PASS 6.51E+03 1.08E+03 9.46E+03 3.56E+03 4.00E+02 PASS 8.24E+03 1.67E+03 1.28E+04 3.65E+03 4.00E+02 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 4.00E+02 PASS An ISO 9001:2000 Certified Company 109 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) 5.00E+04 4.50E+04 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.52. Plot of Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show substantial degradation with radiation, however it is not sufficient for any of the individual units to exceed the post-irradiation test limits. Note that the KTL values are out of specification pre-irradiation and throughout the measurement. As discussed in the text of this report we attribute this to the large standard deviation within the sample population caused by the sensitivity of the measurement to input conditions. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in An ISO 9001:2000 Certified Company 110 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.52. Raw data for Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.77E+04 4.59E+04 3.55E+04 4.39E+04 5.47E+04 3.90E+04 3.36E+04 4.08E+04 2.99E+04 4.78E+04 4.69E+04 10 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 20 1.00E+04 1.00E+04 8.09E+03 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 30 8.69E+03 6.93E+03 7.48E+03 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 50 4.39E+03 3.89E+03 3.90E+03 4.90E+03 4.98E+03 7.37E+03 1.00E+04 7.25E+03 8.97E+03 9.41E+03 1.00E+04 60 4.66E+03 4.89E+03 4.45E+03 5.15E+03 7.02E+03 9.09E+03 1.00E+04 9.98E+03 1.00E+04 1.00E+04 1.00E+04 70 5.20E+03 8.30E+03 9.01E+03 8.99E+03 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 1.00E+04 4.35E+04 7.58E+03 6.43E+04 2.27E+04 1.00E+04 0.00E+00 1.00E+04 1.00E+04 9.62E+03 8.52E+02 1.20E+04 7.28E+03 8.62E+03 1.41E+03 1.25E+04 4.76E+03 4.41E+03 5.22E+02 5.84E+03 2.98E+03 5.24E+03 1.03E+03 8.07E+03 2.40E+03 8.30E+03 1.84E+03 1.33E+04 3.26E+03 3.82E+04 6.90E+03 5.71E+04 1.93E+04 1.00E+03 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 1.00E+03 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 1.00E+03 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 7.00E+02 PASS 8.60E+03 1.23E+03 1.20E+04 5.22E+03 4.00E+02 PASS 9.81E+03 4.05E+02 1.09E+04 8.70E+03 4.00E+02 PASS 1.00E+04 0.00E+00 1.00E+04 1.00E+04 4.00E+02 PASS An ISO 9001:2000 Certified Company 111 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) 2.00E+03 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.53. Plot of Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show substantial degradation with radiation, however it’s not sufficient to cause the parameter to exceed the postirradiation specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 112 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.53. Raw data for Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.64E+03 1.84E+03 1.79E+03 1.66E+03 1.48E+03 1.85E+03 1.70E+03 1.85E+03 1.73E+03 1.61E+03 1.72E+03 10 1.57E+03 1.74E+03 1.74E+03 1.57E+03 1.40E+03 1.77E+03 1.63E+03 1.89E+03 1.61E+03 1.58E+03 1.64E+03 20 1.55E+03 1.65E+03 1.65E+03 1.38E+03 1.36E+03 1.66E+03 1.55E+03 1.74E+03 1.61E+03 1.44E+03 1.65E+03 30 1.39E+03 1.45E+03 1.52E+03 1.38E+03 1.25E+03 1.60E+03 1.48E+03 1.55E+03 1.51E+03 1.37E+03 1.60E+03 50 1.18E+03 1.26E+03 1.29E+03 1.21E+03 1.09E+03 1.44E+03 1.27E+03 1.41E+03 1.35E+03 1.18E+03 1.59E+03 60 1.17E+03 1.26E+03 1.37E+03 1.17E+03 1.08E+03 1.45E+03 1.29E+03 1.54E+03 1.39E+03 1.21E+03 1.69E+03 70 1.25E+03 1.55E+03 1.67E+03 1.41E+03 1.30E+03 1.71E+03 1.50E+03 1.72E+03 1.55E+03 1.42E+03 1.70E+03 1.68E+03 1.40E+02 2.07E+03 1.30E+03 1.60E+03 1.42E+02 1.99E+03 1.22E+03 1.52E+03 1.41E+02 1.90E+03 1.13E+03 1.40E+03 1.01E+02 1.68E+03 1.12E+03 1.21E+03 7.72E+01 1.42E+03 9.95E+02 1.21E+03 1.11E+02 1.51E+03 9.07E+02 1.44E+03 1.76E+02 1.92E+03 9.56E+02 1.75E+03 1.05E+02 2.03E+03 1.46E+03 3.00E+02 PASS 1.70E+03 1.32E+02 2.06E+03 1.34E+03 3.00E+02 PASS 1.60E+03 1.12E+02 1.90E+03 1.29E+03 3.00E+02 PASS 1.50E+03 8.71E+01 1.74E+03 1.26E+03 2.00E+02 PASS 1.33E+03 1.05E+02 1.62E+03 1.04E+03 1.20E+02 PASS 1.38E+03 1.30E+02 1.73E+03 1.02E+03 1.20E+02 PASS 1.58E+03 1.32E+02 1.94E+03 1.22E+03 1.20E+02 PASS An ISO 9001:2000 Certified Company 113 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.54. Plot of Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show substantial degradation with radiation, however it’s not sufficient to cause the parameter to exceed the postirradiation specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 114 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.54. Raw data for Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.40E+03 1.51E+03 1.43E+03 1.38E+03 1.43E+03 1.51E+03 1.49E+03 1.48E+03 1.51E+03 1.42E+03 1.46E+03 10 1.33E+03 1.40E+03 1.35E+03 1.28E+03 1.39E+03 1.46E+03 1.52E+03 1.40E+03 1.51E+03 1.35E+03 1.37E+03 20 1.25E+03 1.36E+03 1.20E+03 1.26E+03 1.27E+03 1.34E+03 1.37E+03 1.32E+03 1.38E+03 1.29E+03 1.41E+03 30 1.18E+03 1.25E+03 1.20E+03 1.17E+03 1.20E+03 1.36E+03 1.35E+03 1.25E+03 1.38E+03 1.24E+03 1.40E+03 50 1.05E+03 1.07E+03 1.02E+03 1.04E+03 1.07E+03 1.21E+03 1.17E+03 1.14E+03 1.10E+03 1.07E+03 1.36E+03 60 1.03E+03 1.13E+03 1.07E+03 1.05E+03 1.10E+03 1.24E+03 1.26E+03 1.12E+03 1.26E+03 1.15E+03 1.39E+03 70 1.05E+03 1.21E+03 1.21E+03 1.19E+03 1.23E+03 1.46E+03 1.47E+03 1.29E+03 1.42E+03 1.33E+03 1.43E+03 1.43E+03 5.08E+01 1.57E+03 1.29E+03 1.35E+03 5.07E+01 1.49E+03 1.21E+03 1.27E+03 5.91E+01 1.43E+03 1.11E+03 1.20E+03 3.14E+01 1.29E+03 1.12E+03 1.05E+03 2.13E+01 1.11E+03 9.89E+02 1.07E+03 4.06E+01 1.18E+03 9.62E+02 1.18E+03 7.27E+01 1.38E+03 9.80E+02 1.48E+03 3.95E+01 1.59E+03 1.37E+03 3.00E+02 PASS 1.45E+03 7.13E+01 1.64E+03 1.25E+03 3.00E+02 PASS 1.34E+03 3.84E+01 1.44E+03 1.23E+03 3.00E+02 PASS 1.31E+03 6.46E+01 1.49E+03 1.14E+03 2.00E+02 PASS 1.14E+03 5.21E+01 1.28E+03 9.95E+02 1.20E+02 PASS 1.20E+03 6.85E+01 1.39E+03 1.02E+03 1.20E+02 PASS 1.40E+03 8.05E+01 1.62E+03 1.17E+03 1.20E+02 PASS An ISO 9001:2000 Certified Company 115 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +15V RL=open (V) 1.44E+01 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.55. Plot of Output Voltage High 1 @ +15V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 116 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.55. Raw data for Output Voltage High 1 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +15V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 10 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 20 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 30 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 50 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 60 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 70 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 8.94E-04 1.42E+01 1.42E+01 1.42E+01 1.10E-03 1.42E+01 1.42E+01 1.42E+01 1.58E-03 1.42E+01 1.42E+01 1.42E+01 1.34E-03 1.42E+01 1.42E+01 1.42E+01 1.79E-03 1.42E+01 1.42E+01 1.42E+01 1.10E-03 1.42E+01 1.42E+01 1.42E+01 1.52E-03 1.42E+01 1.42E+01 1.42E+01 1.41E-03 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 1.48E-03 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 1.48E-03 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 2.28E-03 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 2.61E-03 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 1.67E-03 1.42E+01 1.42E+01 1.30E+01 PASS 1.42E+01 1.64E-03 1.42E+01 1.42E+01 1.30E+01 PASS An ISO 9001:2000 Certified Company 117 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +15V RL=open (V) 1.44E+01 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.56. Plot of Output Voltage High 2 @ +15V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 118 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.56. Raw data for Output Voltage High 2 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +15V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 10 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 20 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 30 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.42E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 50 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.42E+01 1.43E+01 1.43E+01 60 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 70 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.10E-03 1.43E+01 1.43E+01 1.42E+01 1.14E-03 1.43E+01 1.42E+01 1.42E+01 2.28E-03 1.43E+01 1.42E+01 1.42E+01 2.19E-03 1.43E+01 1.42E+01 1.42E+01 2.00E-03 1.43E+01 1.42E+01 1.42E+01 1.10E-03 1.43E+01 1.42E+01 1.42E+01 1.10E-03 1.42E+01 1.42E+01 1.43E+01 1.10E-03 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 4.47E-04 1.43E+01 1.43E+01 1.30E+01 PASS 1.43E+01 1.48E-03 1.43E+01 1.42E+01 1.30E+01 PASS 1.43E+01 1.48E-03 1.43E+01 1.42E+01 1.30E+01 PASS 1.43E+01 1.67E-03 1.43E+01 1.42E+01 1.30E+01 PASS 1.43E+01 1.67E-03 1.43E+01 1.42E+01 1.30E+01 PASS 1.42E+01 8.94E-04 1.43E+01 1.42E+01 1.30E+01 PASS An ISO 9001:2000 Certified Company 119 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +15V RL=2kΩ (V) 1.35E+01 1.30E+01 1.25E+01 1.20E+01 1.15E+01 1.10E+01 1.05E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.57. Plot of Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 120 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.57. Raw data for Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +15V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 10 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 20 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 30 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 50 1.29E+01 1.29E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 60 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 70 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.68E-02 1.29E+01 1.29E+01 1.29E+01 1.74E-02 1.29E+01 1.28E+01 1.29E+01 1.65E-02 1.29E+01 1.28E+01 1.29E+01 1.62E-02 1.29E+01 1.28E+01 1.29E+01 1.62E-02 1.29E+01 1.28E+01 1.29E+01 1.66E-02 1.29E+01 1.28E+01 1.29E+01 1.73E-02 1.29E+01 1.28E+01 1.29E+01 1.14E-02 1.30E+01 1.29E+01 1.10E+01 PASS 1.29E+01 1.16E-02 1.29E+01 1.29E+01 1.10E+01 PASS 1.29E+01 1.19E-02 1.29E+01 1.29E+01 1.10E+01 PASS 1.29E+01 1.28E-02 1.29E+01 1.29E+01 1.10E+01 PASS 1.29E+01 1.43E-02 1.29E+01 1.29E+01 1.10E+01 PASS 1.29E+01 1.36E-02 1.29E+01 1.29E+01 1.10E+01 PASS 1.29E+01 1.25E-02 1.29E+01 1.29E+01 1.10E+01 PASS An ISO 9001:2000 Certified Company 121 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +15V RL=2kΩ (V) 1.35E+01 1.30E+01 1.25E+01 1.20E+01 1.15E+01 1.10E+01 1.05E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.58. Plot of Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 122 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.58. Raw data for Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +15V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 10 1.30E+01 1.30E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 20 1.30E+01 1.30E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 30 1.30E+01 1.30E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 50 1.29E+01 1.30E+01 1.29E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 60 1.30E+01 1.30E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 70 1.30E+01 1.30E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 1.30E+01 1.20E-02 1.30E+01 1.29E+01 1.30E+01 1.21E-02 1.30E+01 1.29E+01 1.30E+01 1.23E-02 1.30E+01 1.29E+01 1.29E+01 1.18E-02 1.30E+01 1.29E+01 1.29E+01 1.13E-02 1.30E+01 1.29E+01 1.29E+01 1.17E-02 1.30E+01 1.29E+01 1.30E+01 1.17E-02 1.30E+01 1.29E+01 1.30E+01 1.79E-02 1.31E+01 1.30E+01 1.10E+01 PASS 1.30E+01 1.81E-02 1.30E+01 1.29E+01 1.10E+01 PASS 1.30E+01 1.81E-02 1.30E+01 1.29E+01 1.10E+01 PASS 1.30E+01 1.82E-02 1.30E+01 1.29E+01 1.10E+01 PASS 1.30E+01 1.84E-02 1.30E+01 1.29E+01 1.10E+01 PASS 1.30E+01 1.82E-02 1.30E+01 1.29E+01 1.10E+01 PASS 1.30E+01 1.84E-02 1.30E+01 1.29E+01 1.10E+01 PASS An ISO 9001:2000 Certified Company 123 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 1 @ +15V RL=open (V) -1.28E+01 -1.30E+01 -1.32E+01 -1.34E+01 -1.36E+01 -1.38E+01 -1.40E+01 -1.42E+01 -1.44E+01 -1.46E+01 -1.48E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.59. Plot of Output Voltage Low 1 @ +15V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 124 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.59. Raw data for Output Voltage Low 1 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +15V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 10 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 20 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 30 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 50 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 24 hr Anneal 168 hr Anneal 60 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 70 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 2.00E-03 1.92E-03 1.14E-03 1.67E-03 1.58E-03 2.00E-03 2.41E-03 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 1.41E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 1.41E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 1.41E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 1.14E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS An ISO 9001:2000 Certified Company 125 -1.46E+01 1.34E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 1.10E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 1.41E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 2 @ +15V RL=open (V) -1.28E+01 -1.30E+01 -1.32E+01 -1.34E+01 -1.36E+01 -1.38E+01 -1.40E+01 -1.42E+01 -1.44E+01 -1.46E+01 -1.48E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.60. Plot of Output Voltage Low 2 @ +15V RL=open (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 126 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.60. Raw data for Output Voltage Low 2 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +15V RL=open (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 10 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 20 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 30 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 50 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 24 hr Anneal 168 hr Anneal 60 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 70 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 2.41E-03 2.00E-03 2.00E-03 2.00E-03 2.00E-03 2.41E-03 2.00E-03 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 2.24E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 2.19E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 2.12E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 2.17E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS An ISO 9001:2000 Certified Company 127 -1.46E+01 2.28E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 2.17E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS -1.46E+01 2.19E-03 -1.46E+01 -1.46E+01 -1.30E+01 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 1 @ +15V RL=2kΩ (V) 0.00E+00 -2.00E+00 -4.00E+00 -6.00E+00 -8.00E+00 -1.00E+01 -1.20E+01 -1.40E+01 -1.60E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.61. Plot of Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 128 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.61. Raw data for Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +15V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 10 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 20 -1.35E+01 -1.36E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.35E+01 30 -1.35E+01 -1.36E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.35E+01 50 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.35E+01 24 hr Anneal 168 hr Anneal 60 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.35E+01 70 -1.35E+01 -1.36E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 2.01E-02 1.93E-02 1.72E-02 1.87E-02 1.89E-02 2.06E-02 1.98E-02 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 2.22E-02 -1.35E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 2.29E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 2.29E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 2.15E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS An ISO 9001:2000 Certified Company 129 -1.36E+01 2.12E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 2.25E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 2.17E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Output Voltage Low 2 @ +15V RL=2kΩ (V) 0.00E+00 -2.00E+00 -4.00E+00 -6.00E+00 -8.00E+00 -1.00E+01 -1.20E+01 -1.40E+01 -1.60E+01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.62. Plot of Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 130 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.62. Raw data for Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +15V RL=2kΩ (V) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.36E+01 -1.36E+01 10 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 20 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 30 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 50 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 24 hr Anneal 168 hr Anneal 60 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 70 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 1.93E-02 1.89E-02 1.68E-02 1.80E-02 1.81E-02 2.03E-02 1.96E-02 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 2.30E-02 -1.36E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 2.23E-02 -1.35E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 2.31E-02 -1.35E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 2.13E-02 -1.35E+01 -1.37E+01 -1.10E+01 PASS An ISO 9001:2000 Certified Company 131 -1.36E+01 2.13E-02 -1.35E+01 -1.37E+01 -1.10E+01 PASS -1.36E+01 2.20E-02 -1.35E+01 -1.36E+01 -1.10E+01 PASS -1.36E+01 2.16E-02 -1.35E+01 -1.37E+01 -1.10E+01 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 1 @ +15V (V/us) 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.63. Plot of Positive Slew Rate 1 @ +15V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 132 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.63. Raw data for Positive Slew Rate 1 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 1 @ +15V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.90E-02 1.05E-01 1.00E-01 8.60E-02 1.03E-01 1.08E-01 1.09E-01 1.12E-01 1.14E-01 1.04E-01 1.01E-01 10 1.21E-01 1.19E-01 1.16E-01 1.17E-01 1.31E-01 1.32E-01 1.35E-01 1.17E-01 1.35E-01 1.23E-01 1.20E-01 20 1.19E-01 1.24E-01 1.17E-01 1.21E-01 1.27E-01 1.32E-01 1.36E-01 1.30E-01 1.17E-01 1.25E-01 1.25E-01 30 1.17E-01 1.14E-01 1.22E-01 1.16E-01 1.21E-01 1.17E-01 1.18E-01 1.27E-01 1.29E-01 1.14E-01 1.18E-01 50 1.15E-01 1.16E-01 1.12E-01 1.07E-01 1.16E-01 1.17E-01 1.13E-01 1.15E-01 1.21E-01 1.07E-01 1.24E-01 60 1.04E-01 1.17E-01 1.15E-01 1.11E-01 1.14E-01 1.23E-01 1.21E-01 1.30E-01 1.26E-01 1.24E-01 1.25E-01 70 1.18E-01 1.25E-01 1.09E-01 1.10E-01 1.18E-01 1.20E-01 1.20E-01 1.17E-01 1.31E-01 1.16E-01 1.20E-01 9.86E-02 7.44E-03 1.19E-01 7.82E-02 1.21E-01 6.02E-03 1.37E-01 1.04E-01 1.22E-01 3.97E-03 1.32E-01 1.11E-01 1.18E-01 3.39E-03 1.27E-01 1.09E-01 1.13E-01 3.83E-03 1.24E-01 1.03E-01 1.12E-01 5.07E-03 1.26E-01 9.83E-02 1.16E-01 6.60E-03 1.34E-01 9.79E-02 1.09E-01 3.85E-03 1.20E-01 9.89E-02 6.00E-02 PASS 1.28E-01 8.05E-03 1.50E-01 1.06E-01 5.00E-02 PASS 1.28E-01 7.31E-03 1.48E-01 1.08E-01 5.00E-02 PASS 1.21E-01 6.60E-03 1.39E-01 1.03E-01 4.00E-02 PASS 1.15E-01 5.18E-03 1.29E-01 1.00E-01 3.00E-02 PASS 1.25E-01 3.42E-03 1.34E-01 1.15E-01 3.00E-02 PASS 1.21E-01 5.97E-03 1.37E-01 1.04E-01 3.00E-02 PASS An ISO 9001:2000 Certified Company 133 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Positive Slew Rate 2 @ +15V (V/us) 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.64. Plot of Positive Slew Rate 2 @ +15V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 134 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.64. Raw data for Positive Slew Rate 2 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 2 @ +15V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.90E-02 1.05E-01 9.50E-02 1.00E-01 1.03E-01 1.09E-01 9.40E-02 1.09E-01 1.15E-01 1.03E-01 8.90E-02 10 1.14E-01 1.24E-01 1.17E-01 1.15E-01 1.26E-01 1.18E-01 1.42E-01 1.27E-01 1.34E-01 1.18E-01 1.23E-01 20 1.15E-01 1.20E-01 1.13E-01 1.11E-01 1.14E-01 1.30E-01 1.30E-01 1.38E-01 1.41E-01 1.23E-01 1.21E-01 30 1.11E-01 1.33E-01 1.11E-01 1.11E-01 1.21E-01 1.21E-01 1.33E-01 1.23E-01 1.26E-01 1.19E-01 1.33E-01 50 1.05E-01 1.18E-01 1.10E-01 1.07E-01 1.12E-01 1.15E-01 1.12E-01 1.15E-01 1.22E-01 1.20E-01 1.29E-01 60 1.11E-01 1.14E-01 1.09E-01 1.12E-01 1.12E-01 1.12E-01 1.20E-01 1.17E-01 1.24E-01 1.16E-01 1.28E-01 70 1.17E-01 1.16E-01 1.09E-01 1.11E-01 1.22E-01 1.20E-01 1.28E-01 1.22E-01 1.31E-01 1.27E-01 1.23E-01 1.00E-01 3.85E-03 1.11E-01 8.99E-02 1.19E-01 5.45E-03 1.34E-01 1.04E-01 1.15E-01 3.36E-03 1.24E-01 1.05E-01 1.17E-01 9.74E-03 1.44E-01 9.07E-02 1.10E-01 5.03E-03 1.24E-01 9.66E-02 1.12E-01 1.82E-03 1.17E-01 1.07E-01 1.15E-01 5.15E-03 1.29E-01 1.01E-01 1.06E-01 7.94E-03 1.28E-01 8.42E-02 6.00E-02 PASS 1.28E-01 1.04E-02 1.56E-01 9.93E-02 5.00E-02 PASS 1.32E-01 7.16E-03 1.52E-01 1.13E-01 5.00E-02 PASS 1.24E-01 5.46E-03 1.39E-01 1.09E-01 4.00E-02 PASS 1.17E-01 4.09E-03 1.28E-01 1.06E-01 3.00E-02 PASS 1.18E-01 4.49E-03 1.30E-01 1.05E-01 3.00E-02 PASS 1.26E-01 4.51E-03 1.38E-01 1.13E-01 3.00E-02 PASS An ISO 9001:2000 Certified Company 135 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 1 @ +15V (V/us) 0.00E+00 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 -1.40E-01 -1.60E-01 -1.80E-01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.65. Plot of Negative Slew Rate 1 @ +15V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 136 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.65. Raw data for Negative Slew Rate 1 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 1 @ +15V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.01E-01 -1.07E-01 -1.00E-01 -9.60E-02 -1.04E-01 -1.12E-01 -1.13E-01 -1.16E-01 -1.23E-01 -1.12E-01 -1.03E-01 10 -1.20E-01 -1.22E-01 -1.22E-01 -1.21E-01 -1.25E-01 -1.32E-01 -1.37E-01 -1.50E-01 -1.38E-01 -1.34E-01 -1.38E-01 20 -1.21E-01 -1.21E-01 -1.22E-01 -1.14E-01 -1.15E-01 -1.26E-01 -1.35E-01 -1.20E-01 -1.48E-01 -1.28E-01 -1.23E-01 30 -1.34E-01 -1.31E-01 -1.20E-01 -1.20E-01 -1.21E-01 -1.35E-01 -1.35E-01 -1.30E-01 -1.38E-01 -1.28E-01 -1.33E-01 50 -1.15E-01 -1.21E-01 -1.03E-01 -1.15E-01 -1.34E-01 -1.32E-01 -1.29E-01 -1.15E-01 -1.38E-01 -1.10E-01 -1.44E-01 24 hr Anneal 168 hr Anneal 60 -1.07E-01 -1.23E-01 -1.14E-01 -1.09E-01 -1.32E-01 -1.21E-01 -1.22E-01 -1.31E-01 -1.41E-01 -1.17E-01 -1.35E-01 70 -1.05E-01 -1.28E-01 -1.23E-01 -1.21E-01 -1.17E-01 -1.18E-01 -1.22E-01 -1.36E-01 -1.28E-01 -1.31E-01 -1.33E-01 -1.02E-01 -1.22E-01 -1.19E-01 -1.25E-01 -1.18E-01 -1.17E-01 -1.19E-01 4.16E-03 1.87E-03 3.78E-03 6.76E-03 1.13E-02 1.04E-02 8.67E-03 -9.02E-02 -1.17E-01 -1.08E-01 -1.07E-01 -8.67E-02 -8.84E-02 -9.50E-02 -1.13E-01 -1.27E-01 -1.29E-01 -1.44E-01 -1.48E-01 -1.46E-01 -1.43E-01 -1.15E-01 4.66E-03 -1.02E-01 -1.28E-01 -6.00E-02 PASS -1.38E-01 7.01E-03 -1.19E-01 -1.57E-01 -5.00E-02 PASS -1.31E-01 1.07E-02 -1.02E-01 -1.61E-01 -5.00E-02 PASS -1.33E-01 4.09E-03 -1.22E-01 -1.44E-01 -4.00E-02 PASS An ISO 9001:2000 Certified Company 137 -1.25E-01 1.18E-02 -9.24E-02 -1.57E-01 -3.00E-02 PASS -1.26E-01 9.63E-03 -1.00E-01 -1.53E-01 -3.00E-02 PASS -1.27E-01 7.14E-03 -1.07E-01 -1.47E-01 -3.00E-02 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Slew Rate 2 @ +15V (V/us) 0.00E+00 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 -1.40E-01 -1.60E-01 -1.80E-01 0 10 20 30 40 50 60 Total Dose (krad(Si)) Figure 5.66. Plot of Negative Slew Rate 2 @ +15V (V/us) versus total dose. The data show no significant change with total dose. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 138 70 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.66. Raw data for Negative Slew Rate 2 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 2 @ +15V (V/us) Device 517 519 533 534 535 536 537 538 541 542 543 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.00E-01 -1.10E-01 -1.01E-01 -9.50E-02 -1.07E-01 -1.17E-01 -9.50E-02 -1.04E-01 -1.21E-01 -1.11E-01 -1.06E-01 10 -1.13E-01 -1.29E-01 -1.13E-01 -1.22E-01 -1.24E-01 -1.32E-01 -1.37E-01 -1.35E-01 -1.40E-01 -1.38E-01 -1.33E-01 20 -1.21E-01 -1.27E-01 -1.19E-01 -1.21E-01 -1.27E-01 -1.26E-01 -1.23E-01 -1.47E-01 -1.35E-01 -1.25E-01 -1.28E-01 30 -1.26E-01 -1.29E-01 -1.32E-01 -1.10E-01 -1.20E-01 -1.34E-01 -1.24E-01 -1.35E-01 -1.32E-01 -1.21E-01 -1.27E-01 50 -1.21E-01 -1.18E-01 -1.21E-01 -1.17E-01 -1.11E-01 -1.25E-01 -1.26E-01 -1.30E-01 -1.30E-01 -1.26E-01 -1.28E-01 24 hr Anneal 168 hr Anneal 60 -1.17E-01 -1.20E-01 -1.23E-01 -1.11E-01 -1.21E-01 -1.35E-01 -1.30E-01 -1.28E-01 -1.33E-01 -1.25E-01 -1.36E-01 70 -1.19E-01 -1.20E-01 -1.08E-01 -1.05E-01 -1.08E-01 -1.36E-01 -1.31E-01 -1.32E-01 -1.26E-01 -1.23E-01 -1.31E-01 -1.03E-01 -1.20E-01 -1.23E-01 -1.23E-01 -1.18E-01 -1.18E-01 -1.12E-01 5.94E-03 7.05E-03 3.74E-03 8.71E-03 4.10E-03 4.67E-03 6.96E-03 -8.63E-02 -1.01E-01 -1.13E-01 -9.95E-02 -1.06E-01 -1.06E-01 -9.29E-02 -1.19E-01 -1.40E-01 -1.33E-01 -1.47E-01 -1.29E-01 -1.31E-01 -1.31E-01 -1.10E-01 1.04E-02 -8.11E-02 -1.38E-01 -6.00E-02 PASS -1.36E-01 3.05E-03 -1.28E-01 -1.45E-01 -5.00E-02 PASS -1.31E-01 9.96E-03 -1.04E-01 -1.59E-01 -5.00E-02 PASS -1.29E-01 6.30E-03 -1.12E-01 -1.46E-01 -4.00E-02 PASS An ISO 9001:2000 Certified Company 139 -1.27E-01 2.41E-03 -1.21E-01 -1.34E-01 -3.00E-02 PASS -1.30E-01 3.96E-03 -1.19E-01 -1.41E-01 -3.00E-02 PASS -1.30E-01 5.13E-03 -1.16E-01 -1.44E-01 -3.00E-02 PASS RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. In addition, all units-under-test received a 24hr room temperature and 168hr 100°C anneal, using the same bias conditions as the radiation exposure. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary were presented in this report. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to determine the outcome of the testing: following the radiation exposure each parameter had to pass the specification value and the average value for the ten-piece sample must pass the specification value when the KTL limits are applied. If these conditions were not both satisfied following the radiation exposure, then the lot would be logged as an RLAT failure. Based on these criteria, the RH1078MW dual operational amplifier discussed in this report passed the RLAT to the highest level tested of 50krad(Si) without any appreciable degradation to most of the measured parameters. Where radiation induced degradation was observed the degradation was not sufficient to cause the parameter to exceed the specification value. An ISO 9001:2000 Certified Company 140 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of Unit-Under-Test to Show Part Markings An ISO 9001:2000 Certified Company 141 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: TID Bias Connections Biased Samples: Pin 1 2 3 4 5 6 7 8 9 10 Function OUT A -INPUT A +INPUT A N/C VN/C +INPUT B -INPUT B OUT B V+ Connection / Bias To Pin 2 via 10kΩ Resistor To Pin 1 via 10kΩ Resistor To 8V via 10kΩ Resistor N/C To –15V using 0.1μF Decoupling N/C To 8V via 10kΩ Resistor To Pin 9 via 10kΩ Resistor To Pin 8 via 10kΩ Resistor To +15V using 0.1μF Decoupling Unbiased Samples: Pin 1 2 3 4 5 6 7 8 9 10 Function OUT A -INPUT A +INPUT A N/C VN/C +INPUT B -INPUT B OUT B V+ Connection / Bias GND GND GND GND GND GND GND GND GND GND An ISO 9001:2000 Certified Company 142 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”. Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”. An ISO 9001:2000 Certified Company 143 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, operational amplifiers, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. Note that test numbers 19 and 20 are modified from the datasheet condition of VCM=100mV to VCM=0V. This is because the LTS2020 measurement circuit has an impedance of approximately 333kΩ, such that at 100mV it is effectively injecting approximately 300nA of current. This amount of current is sufficient to raise the measured VOL by approximately 1mV. Modifying the test condition to VCM=0V in conjunction with biasing the amplifier not being measured (this is a dual op-amp) to a VOUT of approximately 100mV (to make sure it’s not saturated), reduces the current injected by the measurement circuit to 30nA or less. For example, on SN532, Linear Technology’s data (measured on their production test equipment) is 4.19mV and 4.11mV for the A and B amps, respectively. On RAD’s LTS2020 with VCM=100mV we measure 5.88 and 5.41 mV, due to the measurement circuit impedance, as noted above. Using our modified test of VCM=0V on the measured amplifier and VOUT=100mV on the amplifier not being measured we obtain VOL values of 4.46 and 4.13 mV, which are in very good agreement with Linear Technology’s data. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard An ISO 9001:2000 Certified Company 144 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. Table C.1. Measured parameters and test conditions for the RH1078MW. TEST NUMBER TEST DESCRIPTION TEST CONDITIONS 1 Positive Supply Current (ICC2) V=+5V 2 Negative Supply Current (IEE2) V=+5V 3&4 Input Offset Voltage (VOS1 &VOS2) V=+5V 5&6 Input Offset Current (IOS1 & IOS2) V=+5V 7&8 + Input Bias Current (IB+1 & IB+2) V=+5V 9 & 10 - Input Bias Current (IB-1 & IB-2) V=+5V 11 & 12 13 & 14 15 & 16 17 & 18 Common Mode Rejection Ratio (CMRR1 & CMRR2) Power Supply Rejection Ratio (PSRR1 & PSRR2) Large Signal Voltage Gain (AVOL 1 &AVOL2) Large Signal Voltage Gain (AVOL3 &AVOL4) V=+5V, VCM = 0V to 3.5V V= 2.3V to 12V V=+5V, RL =Open V=+5V, RL =50kΩ 19 & 20 VOUT Low (VOUTLOW1 & VOUTLOW2) V=+5V, RL =Open, VCM = 0V* 21 & 22 VOUT Low (VOUTLOW3 & VOUTLOW4) V=+5V, RL =2kΩ 23 & 24 VOUT Low (VOUTLOW5 & VOUTLOW6) V=+5V, ISINK=100µA 25 & 26 VOUT High (VOUTHIGH1 & VOUTHIGH2) V=+5V, RL =Open 27 & 28 VOUT High (VOUTHIGH3 & VOUTHIGH4) V=+5V, RL =2kΩ 29 & 30 +SR (Slew Rate 1 and Slew Rate 2) V=+5V, AV=1 31 & 32 -SR (Slew Rate 3 and Slew Rate 4) V=+5V, AV=1 * This is a non-datasheet condition, see above for explanation. An ISO 9001:2000 Certified Company 145 RLAT Report 08-128 090621 R1.0 33 Positive Supply Current (ICC2) V=±15V 34 Negative Supply Current (IEE2) V=±15V 35 & 36 Input Offset Voltage (VOS3 &VOS4) V=±15V 37 & 38 Input Offset Current (IOS3 & IOS4) V=±15V 39 & 40 + Input Bias Current (IB+3 & IB+4) V=±15V 41 & 42 - Input Bias Current (IB-3 & IB-4) V=±15V 43 & 44 45 & 46 47 & 48 49 & 50 Common Mode Rejection Ratio (CMRR3 & CMRR4) Power Supply Rejection Ratio (PSRR3 & PSRR4) Large Signal Voltage Gain (AVOL 5 &AVOL6) Large Signal Voltage Gain (AVOL 7 &AVOL8) V=±15V, VCM = 13.5V, –15V V= 5V, 0V to ±18V V=±15V, RL=50kΩ V=±15V, RL=2kΩ 51 & 52 VOUT High (VOUTHIGH5 & VOUTHIGH6) V=±15V, RL=50kΩ 53 & 54 VOUT High (VOUTHIGH7 & VOUTHIGH8) V=±15V, RL=2kΩ 55 & 56 VOUT Low (VOUTLOW7 & VOUTLOW8) V=±15V, RL=50kΩ 57 & 58 VOUT Low (VOUTLOW9 & VOUTLOW10) V=±15V, RL=2kΩ 59 & 60 +SR (Slew Rate 5 and Slew Rate 6) V=±15V, AV=1 60 & 61 -SR (Slew Rate 7 and Slew Rate 8) V=±15V, AV=1 An ISO 9001:2000 Certified Company 146 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution for the RH1078MW. Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC) 1.5E-04A ± 1.31E-06A Negative Supply Current (IEE) -1.5E-04A ± 1.07E-06A Input Offset Voltage (VOS1 &VOS2) ±1.2E-04V ± 3.41E-06V Input Offset Current (IOS1 & IOS2) ±8E-10A ± 5.06E-11A + Input Bias Current (IB+1 & IB+2) ±1.5E-08A ± 5.88E-11A - Input Bias Current (IB-1 & IB-2) ±1.5E-08A ± 8.03E-11A 94dB ± 3.12E+00 dB 100dB ± 5.70E+00dB 150V/mV ± 2.69E+02V/mV 120V/mV ± 7.13E+02 V/mV VOUT Low (VOUTLOW1 & VOUTLOW2) 6E-03V ± 1.16E-04V VOUT Low (VOUTLOW3 & VOUTLOW4) 2E-03V ± 3.43E-05V VOUT Low (VOUTLOW5 & VOUTLOW6) 1.3E-01V ± 3.22E-04V VOUT High (VOUTHIGH1 & VOUTHIGH2) 4.2V ± 3.11E-03V VOUT High (VOUTHIGH3 & VOUTHIGH4) 3.5V ± 2.13E-03V +SR (Slew Rate 1 and Slew Rate 2) 4E-02V/μs ± 1.07E-03V/μs -SR (Slew Rate 3 and Slew Rate 4) -4E-02V/μs ± 1.81E-03 V/μs Measured Parameter Common Mode Rejection Ratio (CMRR1 & CMRR2) Power Supply Rejection Ratio (PSRR1 & PSRR2) Large Signal Voltage Gain (AVOL 1 &AVOL2) Large Signal Voltage Gain (AVOL3 &AVOL4) An ISO 9001:2000 Certified Company 147 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC2) 2E-04A ± 1.74E-06A Negative Supply Current (IEE2) -2E-04A ± 9.73E-07A Input Offset Voltage (VOS3 &VOS4) ±3.5E-4V ± 2.51E-06V Input Offset Current (IOS3 & IOS4) ±8E-10A ± 3.54E-11A + Input Bias Current (IB+3 & IB+4) ±1.5E-08A ± 3.89E-11A - Input Bias Current (IB-3 & IB-4) ±1.5E-08A ± 7.51E-11A 97dB ± 2.98E-01dB 100dB ± 4.20E+00dB 1000V/mV ± 2.34E+04V/mV 300V/mV ± 7.07E+01V/mV VOUT High (VOUTHIGH5 & VOUTHIGH6) 13V ± 2.38E-03V VOUT High (VOUTHIGH7 & VOUTHIGH8) 11V ± 1.17E-03V VOUT Low (VOUTLOW7 & VOUTLOW8) -13V ± 1.75E-03V VOUT Low (VOUTLOW9 & VOUTLOW10) -11V ± 4.14E-03V +SR (Slew Rate 5 and Slew Rate 6) 6E-02V/μs ± 6.97E-03V/μs -SR (Slew Rate 7 and Slew Rate 8) -6E-02V/μs ± 9.02E-03V/μs Measured Parameter Common Mode Rejection Ratio (CMRR3 & CMRR4) Power Supply Rejection Ratio (PSRR3 & PSRR4) Large Signal Voltage Gain (AVOL 5 &AVOL6) Large Signal Voltage Gain (AVOL 7 &AVOL8) An ISO 9001:2000 Certified Company 148 RLAT Report 08-128 090621 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix D: List of Figures used in Section 5.0 (RLAT Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current @+5V (A) Negative Supply Current @+5V (A) Input Offset Voltage 1 @ +5V (V) Input Offset Voltage 2 @ +5V (V) Input Offset Current 1 @ +5V (A) Input Offset Current 2 @ +5V (A) Positive Input Bias Current 1 @ +5V (A) Positive Input Bias Current 2 @ +5V (A) Negative Input Bias Current 1 @ +5V (A) Negative Input Bias Current 2 @+5V (A) Common Mode Rejection Ratio 1 @ +5V (dB) Common Mode Rejection Ratio 2 @ +5V (dB) Power Supply Rejection Ratio 1 @ +5V (dB) Power Supply Rejection Ratio 2 @ +5V (dB) Open Loop Gain 1 @ +5V, RL=open (V/mV) Open Loop Gain 2 @ +5V, RL=open (V/mV) Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) Open Loop Gain 1 @ +5V, RL=open (dB) Open Loop Gain 2 @ +5V, RL=open (dB) Open Loop Gain 3 @ +5V, RL=50k (dB) Open Loop Gain 4 @ +5V, RL=50k (dB) Output Voltage Low 1 @ +5V RL=open (V) Output Voltage Low 2 @ +5V RL=open (V) Output Voltage Low 1 @ +5V RL=2kΩ (V) Output Voltage Low 2 @ +5V RL=2kΩ (V) Output Voltage Low 1 @ +5V IL=100uA (V) Output Voltage Low 2 @ +5V IL=100uA (V) Output Voltage High 1 @ +5V RL=open (V) Output Voltage High 2 @ +5V RL=open (V) Output Voltage High 1 @ +5V RL=2kΩ (V) Output Voltage High 2 @ +5V RL=2kΩ (V) Positive Slew Rate 1 @ +5V (V/us) Positive Slew Rate 2 @ +5V (V/us) Negative Slew Rate 1 @ +5V (V/us) Negative Slew Rate 2 @ +5V (V/us) Positive Supply Current @+15V (A) Negative Supply Current @+15V (A) Input Offset Voltage 1 @ +15V (V) An ISO 9001:2000 Certified Company 149 RLAT Report 08-128 090621 R1.0 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 5.63 5.64 5.65 5.66 Input Offset Voltage 2 @ +15V (V) Input Offset Current 1 @ +15V (A) Input Offset Current 2 @ +15V (A) Positive Input Bias Current 1 @ +15V (A) Positive Input Bias Current 2 @ +15V (A) Negative Input Bias Current 1 @ +15V (A) Negative Input Bias Current 2 @ +15V (A) Common Mode Rejection Ratio 1 @ +15V (dB) Common Mode Rejection Ratio 2 @ +15V (dB) Power Supply Rejection Ratio 1 @ +15V (dB) Power Supply Rejection Ratio 2 @ +15V (dB) Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) Output Voltage High 1 @ +15V RL=open (V) Output Voltage High 2 @ +15V RL=open (V) Output Voltage High 1 @ +15V RL=2kΩ (V) Output Voltage High 2 @ +15V RL=2kΩ (V) Output Voltage Low 1 @ +15V RL=open (V) Output Voltage Low 2 @ +15V RL=open (V) Output Voltage Low 1 @ +15V RL=2kΩ (V) Output Voltage Low 2 @ +15V RL=2kΩ (V) Positive Slew Rate 1 @ +15V (V/us) Positive Slew Rate 2 @ +15V (V/us) Negative Slew Rate 1 @ +15V (V/us) Negative Slew Rate 2 @ +15V (V/us) An ISO 9001:2000 Certified Company 150 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800