RLAT 100K Report_RH1078MW_Fab Lot WP1630.2.pdf

RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Lot Acceptance Testing (RLAT) of the RH1078MW Dual Precision
Op Amp for Linear Technology
Customer: Linear Technology, PO# 53274L
RAD Job Number: 09-300
Part Type Tested: Linear Technology RH1078MW Dual Precision Operational Amplifier
Commercial Part Number: RH1078MW
Traceability Information: Lot Date Code: 0808B, Fab # WP1630.2 Wafer 8, Assy Lot A21527.1. Information
obtained from Linear Technology PO#53274L. See Appendix A for a photograph of the unit-under-test
Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation (all pins tied to
ground) and 2 control units. Serial numbers 408-412 were biased during irradiation, serial numbers 413-415, 418 and
419 were unbiased during irradiation and serial numbers 420 and 421 were used as the controls. See Appendix B for
the radiation bias connection table.
External Traveler: None required
Pre-Irradiation Burn-In: Burn-In performed by Linear Devices prior to receipt by RAD.
TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 20, 50, 100, and 200krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest or anneal.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware and Software: LTS2020 Tester (TS03), 2101 Family Board (FB02), 0600 Fixture (TF01) and
RH1078 DUT Board (BGSS-080820) and RH1078LT.SRC test program.
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5.
Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C±6°C per MILSTD-883.
RLAT Result: PASSED. Units passed to 200krad(Si) for the ±15V supply
condition and to 100krad(Si) for the single sided 5V supply condition with
all parameters remaining within specification, including after application
of 90/90 KTL statistics.
An ISO 9001:2000 Certified Company
1
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883 TM1019.7 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias
boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to
provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices
Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute
of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60
irradiator at RAD’s Longmire Laboratory facility.
RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability
under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019
Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L.
Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices”
An ISO 9001:2000 Certified Company
2
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by
positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this
irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of
approximately 2-feet.
An ISO 9001:2000 Certified Company
3
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH1078MW dual precision op amps described in this final report were irradiated using a split 15V
supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix
B for the full bias circuits. These bias circuits satisfy the requirements of MIL-STD-883G TM1019.7
Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be
selected to produce the greatest radiation induced damage or the worst-case damage for the intended
application, if known. While maximum voltage is often worst case some bipolar linear device
parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V
bias.”
The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental
readings at 20, 50, 100 and 200krad(Si) for all electrical tests using the ±15V supply and with
incremental readings at 20, 50 and 100krad(Si) for all electrical tests using the +5V and 0V supply
conditions (See LINEAR TECHNOLOGY CORPORATION RH1078M Dual Precision Operational
Amplifier Datasheet). Note that although we tested this device to 100krad(Si) using the +5V supply
condition and the units-under-test passed to 100krad(Si) it is only guaranteed by the manufacturer to
75krad(Si).
Electrical testing occurred within one hour following the end of each irradiation segment. For
intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from
the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under
MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum enclosure was determined based on TLD dosimetry
measurements (see previous section). The final dose rate for this work was 62.6rad(Si)/s with a precision
of ±5%.
An ISO 9001:2000 Certified Company
4
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the radiation lot acceptance testing the pre- and post-irradiation electrical parameters measured
were:
±15V Tests
Positive Supply Current (ICC2)
Negative Supply Current (IEE2)
Input Offset Voltage (VOS3 &VOS4)
Input Offset Current (IOS3 & IOS4)
+ Input Bias Current (IB+3 & IB+4)
- Input Bias Current (IB-3 & IB-4)
Common Mode Rejection Ratio (CMRR3 & CMRR4)
Power Supply Rejection Ratio (PSRR3 & PSRR4)
Large Signal Voltage Gain (AVOL 5 &AVOL6)
Large Signal Voltage Gain (AVOL 7 &AVOL8)
VOUT High (VOUTHIGH5 & VOUTHIGH6)
VOUT High (VOUTHIGH7 & VOUTHIGH8)
VOUT Low (VOUTLOW7 & VOUTLOW8)
VOUT Low (VOUTLOW9 & VOUTLOW10)
+SR (Slew Rate 5 and Slew Rate 6)
-SR (Slew Rate 7 and Slew Rate 8)
+5V Tests
Positive Supply Current (ICC2)
Negative Supply Current (IEE2)
Input Offset Voltage (VOS1 &VOS2)
Input Offset Current (IOS1 & IOS2)
+ Input Bias Current (IB+1 & IB+2)
- Input Bias Current (IB-1 & IB-2)
Common Mode Rejection Ratio (CMRR1 & CMRR2)
Power Supply Rejection Ratio (PSRR1 & PSRR2)
Large Signal Voltage Gain (AVOL 1 &AVOL2)
Large Signal Voltage Gain (AVOL3 &AVOL4)
VOUT Low (VOUTLOW1 & VOUTLOW2)
VOUT Low (VOUTLOW3 & VOUTLOW4)
VOUT Low (VOUTLOW5 & VOUTLOW6)
VOUT High (VOUTHIGH1 & VOUTHIGH2)
VOUT High (VOUTHIGH3 & VOUTHIGH4)
+SR (Slew Rate 1 and Slew Rate 2)
-SR (Slew Rate 3 and Slew Rate 4)
An ISO 9001:2000 Certified Company
5
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used is 2.742 per MIL HDBK 814 using one
sided tolerance limits of 90/90 and a 5-piece sample size. Note that the following criteria must be met
for a device to pass the RLAT: following the radiation exposure each of the 5 pieces shall pass the
specification value and the average value for the ten-piece sample must pass the specification value
when the KTL limits are applied. If either of these conditions is not satisfied following the radiation
exposure, then the lot could be logged as a failure.
5.0. Total Ionizing Dose Test Results
The RH1078MW operational amplifiers passed the RLAT to the maximum tested level of 200krad(Si)
(for the ±15V supply conditions) and 100krad(Si) (for the +5V and 0V supply conditions) with all
measured parameters remaining within specification, including after application of the KTL statistics.
The following exception should be noted, the input offset voltage for the 5V supply condition was out of
specification intermittently after application of the KTL statistics due to a combination of an aggressive
specification value and relative large distribution of the sample population. The input offset voltage was
within specification at the 100krad(Si) read point.
Figures 5.1 and 5.62 show plots of all the measured parameters versus total ionizing dose while Tables
5.1 – 5.62 show the corresponding raw data for each of these parameters. Appendix D lists all the
figures in this section to aid in locating a particular parameter. As seen in the data tables the control
units, as expected, show no significant changes throughout the test indicating that our electrical testing
remained stable throughout the testing.
In the data plots the solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
6
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Supply Current @ +5V (A)
1.60E-04
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current @ +5V (A) versus total dose. The data show no significant
change (or slight improvement) with radiation. The solid diamonds are the average of the measured data
points for the samples irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the samples irradiated
under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
7
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.1. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
9.40E-05
9.10E-05
9.90E-05
9.70E-05
9.00E-05
9.00E-05
9.10E-05
9.90E-05
9.90E-05
9.20E-05
9.30E-05
8.90E-05
20
8.80E-05
8.70E-05
9.30E-05
8.90E-05
8.30E-05
8.20E-05
8.60E-05
9.30E-05
9.40E-05
8.40E-05
9.60E-05
8.60E-05
50
7.80E-05
7.70E-05
8.20E-05
7.80E-05
7.70E-05
7.10E-05
7.70E-05
8.20E-05
8.30E-05
7.50E-05
9.50E-05
8.80E-05
100
6.50E-05
6.30E-05
6.40E-05
6.30E-05
5.80E-05
5.40E-05
6.10E-05
6.40E-05
6.10E-05
6.30E-05
9.40E-05
8.60E-05
9.42E-05
3.83E-06
1.05E-04
8.37E-05
8.80E-05
3.61E-06
9.79E-05
7.81E-05
7.84E-05
2.07E-06
8.41E-05
7.27E-05
6.26E-05
2.70E-06
7.00E-05
5.52E-05
9.42E-05
8.78E-05
7.76E-05
6.06E-05
4.44E-06
5.40E-06
4.98E-06
3.91E-06
1.06E-04
1.03E-04
9.13E-05
7.13E-05
8.20E-05
7.30E-05
6.39E-05
4.99E-05
1.50E-04
1.50E-04
1.50E-04
1.50E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
8
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Negative Supply Current @ +5V (A)
0.00E+00
-2.00E-05
-4.00E-05
-6.00E-05
-8.00E-05
-1.00E-04
-1.20E-04
-1.40E-04
-1.60E-04
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current @ +5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
9
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.2. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-9.00E-05
-9.00E-05
-9.60E-05
-9.30E-05
-8.60E-05
-8.70E-05
-9.00E-05
-9.70E-05
-9.80E-05
-9.10E-05
-9.00E-05
-8.50E-05
20
-8.30E-05
-8.30E-05
-9.00E-05
-8.60E-05
-8.00E-05
-8.10E-05
-8.40E-05
-9.10E-05
-9.00E-05
-8.40E-05
-9.00E-05
-8.50E-05
50
-7.50E-05
-7.40E-05
-8.00E-05
-7.60E-05
-7.30E-05
-8.70E-05
-7.50E-05
-8.00E-05
-7.90E-05
-7.30E-05
-9.10E-05
-8.50E-05
100
-4.60E-05
-7.00E-05
-6.60E-05
-6.10E-05
-5.80E-05
-3.60E-05
-6.20E-05
-3.30E-05
-4.50E-05
-4.20E-05
-9.10E-05
-8.50E-05
-9.10E-05
3.74E-06
-8.07E-05
-1.01E-04
-8.44E-05
3.78E-06
-7.40E-05
-9.48E-05
-7.56E-05
2.70E-06
-6.82E-05
-8.30E-05
-6.02E-05
9.18E-06
-3.50E-05
-8.54E-05
-9.26E-05 -8.60E-05 -7.88E-05 -4.36E-05
4.72E-06
4.30E-06
5.40E-06
1.13E-05
-7.97E-05 -7.42E-05 -6.40E-05 -1.25E-05
-1.06E-04 -9.78E-05 -9.36E-05 -7.47E-05
-1.50E-04 -1.50E-04 -1.50E-04 -1.50E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
10
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 1 @ +5V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant change
with radiation, however the KTL values are out of specification early in the test due to a combination of an
aggressive specification and relatively large distribution within the sample population. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
11
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for Input Offset Voltage 1 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 @ +5V (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.82E-05
4.09E-05
4.22E-05
4.60E-06
4.45E-05
5.24E-05
4.77E-05
-4.19E-05
-8.80E-06
3.76E-06
1.34E-05
-1.89E-05
20
-5.77E-05
2.87E-05
1.41E-05
-8.57E-06
3.08E-05
4.87E-05
4.72E-05
-5.38E-05
-1.01E-05
8.23E-06
1.34E-05
-1.80E-05
50
-5.87E-05
5.22E-05
7.38E-06
3.75E-06
4.46E-05
5.19E-05
5.21E-05
-9.88E-05
-3.59E-05
9.41E-06
1.17E-05
-1.98E-05
100
-2.56E-05
9.47E-05
4.00E-05
6.35E-05
7.44E-05
1.09E-04
9.32E-05
-9.72E-05
-1.16E-05
4.43E-05
1.62E-05
-1.68E-05
1.88E-05
3.58E-05
1.17E-04
-7.95E-05
1.47E-06
3.66E-05
1.02E-04
-9.90E-05
9.84E-06
4.40E-05
1.30E-04
-1.11E-04
4.94E-05
4.63E-05
1.76E-04
-7.76E-05
1.06E-05
8.05E-06 -4.25E-06
2.76E-05
3.97E-05
4.28E-05
6.41E-05
8.42E-05
1.19E-04
1.25E-04
1.72E-04
2.58E-04
-9.81E-05 -1.09E-04 -1.80E-04 -2.03E-04
-1.20E-04 -1.20E-04 -2.50E-04 -5.00E-04
PASS
PASS
PASS
PASS
1.20E-04
1.20E-04
2.50E-04
5.00E-04
PASS
FAIL
PASS
PASS
An ISO 9001:2000 Certified Company
12
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 2 @ +5V (V)
6.00E-04
4.00E-04
2.00E-04
0.00E+00
-2.00E-04
-4.00E-04
-6.00E-04
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant change
with radiation, however the KTL values are out of specification early in the test due to a combination of an
aggressive specification and relatively large distribution within the sample population. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
13
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for Input Offset Voltage 2 @ +5V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 2 @ +5V (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.17E-05
-3.21E-05
-6.17E-05
1.05E-05
3.25E-05
-3.88E-05
-4.60E-05
-4.54E-05
-1.00E-05
3.86E-05
-2.98E-05
-5.36E-05
20
-5.93E-05
-6.16E-05
-8.92E-05
-8.82E-06
1.21E-05
-6.57E-05
-7.08E-05
-8.77E-05
-2.85E-05
1.70E-05
-3.13E-05
-5.36E-05
50
-5.89E-05
-5.71E-05
-9.65E-05
9.19E-06
2.56E-05
-5.48E-05
-6.17E-05
-9.68E-05
-1.29E-05
2.01E-05
-2.72E-05
-5.46E-05
100
-3.79E-05
-1.62E-05
-6.04E-05
6.12E-05
6.04E-05
-4.34E-06
-6.63E-06
-8.02E-05
6.42E-05
5.62E-05
-2.76E-05
-5.45E-05
-1.65E-05
3.76E-05
8.65E-05
-1.19E-04
-4.14E-05
4.16E-05
7.28E-05
-1.56E-04
-3.55E-05
5.12E-05
1.05E-04
-1.76E-04
1.43E-06
5.64E-05
1.56E-04
-1.53E-04
-2.03E-05 -4.71E-05 -4.12E-05
5.85E-06
3.61E-05
4.19E-05
4.54E-05
5.83E-05
7.86E-05
6.77E-05
8.33E-05
1.66E-04
-1.19E-04 -1.62E-04 -1.66E-04 -1.54E-04
-1.20E-04 -1.20E-04 -2.50E-04 -5.00E-04
PASS
FAIL
PASS
PASS
1.20E-04
1.20E-04
2.50E-04
5.00E-04
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
14
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 1 @ +5V (A)
2.00E-08
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.5. Plot of Input Offset Current 1 @ +5V (A) versus total dose. The data show no significant change
with radiation. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
15
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for Input Offset Current 1 @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 1 @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-9.00E-11
4.00E-11
-2.50E-10
-1.50E-10
-1.50E-10
-1.40E-10
3.00E-11
-2.10E-10
-1.00E-11
-5.00E-11
9.00E-11
-3.00E-11
20
-3.30E-10
-3.00E-11
-9.00E-11
-2.50E-10
-2.80E-10
-1.00E-10
-1.00E-10
-1.80E-10
-7.00E-11
-1.00E-11
4.00E-11
-6.00E-11
50
-4.50E-10
7.00E-11
-3.20E-10
-1.50E-10
-8.00E-11
-1.50E-10
-2.10E-10
-3.10E-10
-9.00E-11
-2.00E-11
-5.00E-11
3.00E-11
100
-5.60E-10
2.00E-11
-1.50E-10
-1.00E-10
-4.10E-10
-1.30E-10
-3.20E-10
-3.30E-10
-1.20E-10
1.00E-10
0.00E+00
-1.30E-10
-1.20E-10
1.06E-10
1.71E-10
-4.11E-10
-1.96E-10
1.29E-10
1.58E-10
-5.50E-10
-1.86E-10
2.04E-10
3.72E-10
-7.44E-10
-2.40E-10
2.38E-10
4.13E-10
-8.93E-10
-7.60E-11 -9.20E-11 -1.56E-10 -1.60E-10
9.79E-11
6.14E-11
1.11E-10
1.76E-10
1.92E-10
7.64E-11
1.49E-10
3.24E-10
-3.44E-10 -2.60E-10 -4.61E-10 -6.44E-10
-8.00E-10 -2.00E-09 -1.30E-08 -1.80E-08
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
1.30E-08
1.80E-08
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
16
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 2 @ +5V (A)
2.00E-08
1.50E-08
1.00E-08
5.00E-09
0.00E+00
-5.00E-09
-1.00E-08
-1.50E-08
-2.00E-08
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.6. Plot of Input Offset Current 2 @ +5V (A) versus total dose. The data show no significant change
with radiation. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
17
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for Input Offset Current 2 @ +5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 2 @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
8.00E-11
-9.00E-11
-1.60E-10
-1.80E-10
-1.20E-10
0.00E+00
-4.00E-11
-3.00E-11
-5.00E-11
-1.60E-10
-2.50E-10
-3.00E-11
20
3.00E-11
-9.00E-11
0.00E+00
4.00E-11
-1.30E-10
-6.00E-11
-9.00E-11
-2.00E-10
-5.10E-10
-1.30E-10
-2.30E-10
3.00E-11
50
3.00E-11
-2.20E-10
-1.50E-10
-1.50E-10
-2.70E-10
-1.60E-10
-9.00E-11
2.00E-11
-1.29E-09
-3.20E-10
-7.00E-11
0.00E+00
100
1.20E-10
-4.20E-10
-3.60E-10
-2.30E-10
-6.00E-11
-1.30E-10
-1.90E-10
-8.00E-11
-4.15E-09
-1.50E-10
-1.50E-10
3.00E-11
-9.40E-11
1.03E-10
1.89E-10
-3.77E-10
-3.00E-11
7.58E-11
1.78E-10
-2.38E-10
-1.52E-10
1.14E-10
1.60E-10
-4.64E-10
-1.90E-10
2.22E-10
4.18E-10
-7.98E-10
-5.60E-11 -1.98E-10 -3.68E-10 -9.40E-10
6.11E-11
1.82E-10
5.30E-10
1.79E-09
1.11E-10
3.01E-10
1.09E-09
3.98E-09
-2.23E-10 -6.97E-10 -1.82E-09 -5.86E-09
-8.00E-10 -2.00E-09 -1.30E-08 -1.80E-08
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
1.30E-08
1.80E-08
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
18
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 1 @ +5V (A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.7. Plot of Positive Input Bias Current 1 @ +5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
19
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for Positive Input Bias Current 1 @ +5V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 1 @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
7.75E-09
8.28E-09
8.62E-09
8.23E-09
8.45E-09
8.06E-09
8.68E-09
7.73E-09
8.01E-09
8.88E-09
8.27E-09
8.67E-09
20
1.17E-08
1.16E-08
1.24E-08
1.18E-08
1.24E-08
1.19E-08
1.26E-08
1.18E-08
1.24E-08
1.35E-08
8.18E-09
8.83E-09
50
1.81E-08
1.79E-08
1.87E-08
1.84E-08
1.86E-08
1.84E-08
1.95E-08
1.86E-08
1.97E-08
2.06E-08
8.24E-09
8.78E-09
100
2.90E-08
2.80E-08
2.95E-08
2.81E-08
2.84E-08
2.79E-08
3.00E-08
2.99E-08
3.03E-08
3.13E-08
8.20E-09
8.76E-09
8.27E-09
3.27E-10
9.16E-09
7.37E-09
1.20E-08
3.84E-10
1.30E-08
1.09E-08
1.83E-08
3.26E-10
1.92E-08
1.74E-08
2.86E-08
6.41E-10
3.04E-08
2.68E-08
8.27E-09
1.24E-08
1.93E-08
2.99E-08
4.86E-10
6.98E-10
8.96E-10
1.25E-09
9.60E-09
1.44E-08
2.18E-08
3.33E-08
6.94E-09
1.05E-08
1.69E-08
2.65E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.00E-07
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
20
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Positive Input Bias Current 2 @ +5V
(A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.8. Plot of Positive Input Bias Current 2 @ +5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
21
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for Positive Input Bias Current 2 @ +5V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 2 @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
8.13E-09
8.13E-09
8.59E-09
8.06E-09
8.48E-09
8.21E-09
8.86E-09
7.65E-09
7.89E-09
9.00E-09
8.18E-09
8.85E-09
20
1.22E-08
1.14E-08
1.25E-08
1.20E-08
1.25E-08
1.21E-08
1.28E-08
1.17E-08
1.25E-08
1.35E-08
8.29E-09
8.87E-09
50
1.90E-08
1.76E-08
1.87E-08
1.86E-08
1.87E-08
1.84E-08
1.97E-08
1.88E-08
2.00E-08
2.06E-08
8.18E-09
8.89E-09
100
3.00E-08
2.75E-08
2.96E-08
2.84E-08
2.84E-08
2.80E-08
3.06E-08
3.01E-08
3.13E-08
3.15E-08
8.25E-09
8.83E-09
8.28E-09
2.40E-10
8.93E-09
7.62E-09
1.21E-08
4.27E-10
1.33E-08
1.09E-08
1.85E-08
5.46E-10
2.00E-08
1.70E-08
2.88E-08
9.92E-10
3.15E-08
2.61E-08
8.32E-09
1.25E-08
1.95E-08
3.03E-08
5.92E-10
6.77E-10
9.01E-10
1.40E-09
9.94E-09
1.44E-08
2.20E-08
3.41E-08
6.70E-09
1.07E-08
1.70E-08
2.64E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.00E-07
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
22
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Negative Input Bias Current 1 @ +5V
(A)
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.9. Plot of Negative Input Bias Current 1 @ +5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
23
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for Negative Input Bias Current 1 @ +5V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 1 @ +5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
8.02E-09
8.15E-09
8.64E-09
8.37E-09
8.52E-09
8.26E-09
8.74E-09
7.87E-09
8.10E-09
9.04E-09
8.25E-09
8.79E-09
20
1.19E-08
1.18E-08
1.23E-08
1.20E-08
1.26E-08
1.21E-08
1.28E-08
1.20E-08
1.26E-08
1.36E-08
8.24E-09
8.82E-09
50
1.85E-08
1.79E-08
1.91E-08
1.86E-08
1.90E-08
1.85E-08
1.96E-08
1.90E-08
1.99E-08
2.05E-08
8.27E-09
8.83E-09
100
2.96E-08
2.80E-08
2.99E-08
2.84E-08
2.88E-08
2.83E-08
3.07E-08
3.02E-08
3.07E-08
3.15E-08
8.19E-09
8.86E-09
8.34E-09
2.56E-10
9.04E-09
7.64E-09
1.21E-08
3.44E-10
1.30E-08
1.12E-08
1.86E-08
4.74E-10
1.99E-08
1.73E-08
2.89E-08
8.11E-10
3.12E-08
2.67E-08
8.40E-09
1.26E-08
1.95E-08
3.03E-08
4.78E-10
6.28E-10
7.84E-10
1.18E-09
9.71E-09
1.43E-08
2.16E-08
3.35E-08
7.09E-09
1.09E-08
1.73E-08
2.70E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.00E-07
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
24
Negative Input Bias Current 2 @+5V (A)
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.10. Plot of Negative Input Bias Current 2 @+5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
25
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for Negative Input Bias Current 2 @+5V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 2 @+5V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
8.18E-09
8.29E-09
8.69E-09
8.21E-09
8.62E-09
8.16E-09
8.96E-09
7.89E-09
8.07E-09
9.21E-09
8.31E-09
9.01E-09
20
1.21E-08
1.18E-08
1.25E-08
1.21E-08
1.25E-08
1.21E-08
1.31E-08
1.21E-08
1.29E-08
1.37E-08
8.43E-09
8.95E-09
50
1.89E-08
1.80E-08
1.92E-08
1.87E-08
1.91E-08
1.86E-08
1.98E-08
1.88E-08
2.13E-08
2.08E-08
8.37E-09
8.86E-09
100
3.02E-08
2.80E-08
2.99E-08
2.86E-08
2.87E-08
2.81E-08
3.06E-08
3.01E-08
3.55E-08
3.16E-08
8.33E-09
8.95E-09
8.40E-09
2.39E-10
9.05E-09
7.74E-09
1.22E-08
3.17E-10
1.30E-08
1.13E-08
1.88E-08
4.79E-10
2.01E-08
1.75E-08
2.91E-08
9.42E-10
3.17E-08
2.65E-08
8.46E-09
1.28E-08
1.98E-08
3.12E-08
5.87E-10
6.94E-10
1.18E-09
2.73E-09
1.01E-08
1.47E-08
2.31E-08
3.87E-08
6.85E-09
1.09E-08
1.66E-08
2.37E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.00E-07
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
26
Common Mode Rejection Ratio 1 @ +5V (dB)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.10E+02
1.05E+02
1.00E+02
9.50E+01
9.00E+01
8.50E+01
8.00E+01
7.50E+01
7.00E+01
6.50E+01
6.00E+01
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.11. Plot of Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose. The data show some
degradation with radiation, however the parameter remains within specification even after application of the
KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
27
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 1 @ +5V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.11E+02
1.00E+02
1.07E+02
1.04E+02
1.03E+02
1.11E+02
1.03E+02
1.06E+02
1.06E+02
1.00E+02
1.01E+02
1.09E+02
20
1.08E+02
9.84E+01
9.95E+01
1.02E+02
1.02E+02
9.82E+01
1.04E+02
1.04E+02
1.06E+02
1.01E+02
1.05E+02
1.01E+02
50
1.06E+02
9.74E+01
9.75E+01
9.71E+01
9.98E+01
9.99E+01
1.01E+02
1.02E+02
1.01E+02
1.00E+02
1.03E+02
1.05E+02
100
1.05E+02
9.74E+01
9.69E+01
9.85E+01
9.92E+01
9.65E+01
9.74E+01
9.91E+01
9.98E+01
9.92E+01
1.02E+02
1.05E+02
1.05E+02
3.91E+00
1.16E+02
9.43E+01
1.02E+02
3.77E+00
1.12E+02
9.18E+01
9.96E+01
3.84E+00
1.10E+02
8.91E+01
9.95E+01
3.45E+00
1.09E+02
9.00E+01
1.05E+02 1.03E+02 1.01E+02 9.84E+01
3.91E+00 2.96E+00
8.61E-01 1.39E+00
1.16E+02 1.11E+02 1.03E+02 1.02E+02
9.46E+01 9.45E+01 9.85E+01 9.46E+01
9.40E+01 9.10E+01 8.70E+01 8.50E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
28
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio 2 @ +5V (dB)
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.12. Plot of Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose. The data show some
degradation with radiation, however the parameter remains within specification even after application of the
KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
29
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 2 @ +5V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.26E+02
1.10E+02
1.10E+02
1.13E+02
1.25E+02
1.06E+02
1.06E+02
1.16E+02
1.10E+02
1.04E+02
1.09E+02
1.10E+02
20
1.09E+02
1.02E+02
1.08E+02
1.05E+02
1.05E+02
1.03E+02
1.03E+02
1.05E+02
1.10E+02
1.01E+02
1.06E+02
1.07E+02
50
1.07E+02
1.02E+02
1.01E+02
1.01E+02
1.06E+02
1.00E+02
1.00E+02
1.09E+02
1.11E+02
9.87E+01
1.05E+02
1.06E+02
100
1.02E+02
9.86E+01
1.00E+02
1.00E+02
1.03E+02
9.81E+01
9.85E+01
1.02E+02
1.06E+02
9.92E+01
1.09E+02
1.10E+02
1.17E+02
8.06E+00
1.39E+02
9.46E+01
1.06E+02
2.64E+00
1.13E+02
9.86E+01
1.03E+02
2.73E+00
1.11E+02
9.59E+01
1.01E+02
1.65E+00
1.05E+02
9.63E+01
1.08E+02 1.04E+02 1.04E+02 1.01E+02
4.95E+00 3.66E+00 5.61E+00 3.19E+00
1.22E+02 1.14E+02 1.19E+02 1.09E+02
9.49E+01 9.44E+01 8.83E+01 9.19E+01
9.40E+01 9.10E+01 8.70E+01 8.50E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
30
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 1 @ +5V (dB)
1.40E+02
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.13. Plot of Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose. The data show some
degradation with radiation, however the parameter remains within specification even after application of the
KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
31
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 1 @ +5V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.23E+02
1.20E+02
1.40E+02
1.49E+02
1.32E+02
1.27E+02
1.26E+02
1.41E+02
1.23E+02
1.20E+02
1.17E+02
1.29E+02
20
1.16E+02
1.19E+02
1.33E+02
1.21E+02
1.30E+02
1.23E+02
1.19E+02
1.44E+02
1.38E+02
1.26E+02
1.15E+02
1.22E+02
50
1.15E+02
1.36E+02
1.27E+02
1.19E+02
1.21E+02
1.20E+02
1.30E+02
1.38E+02
1.19E+02
1.19E+02
1.16E+02
1.21E+02
100
1.12E+02
1.21E+02
1.17E+02
1.10E+02
1.17E+02
1.14E+02
1.15E+02
1.21E+02
1.12E+02
1.14E+02
1.28E+02
1.19E+02
1.33E+02
1.20E+01
1.66E+02
1.00E+02
1.24E+02
7.11E+00
1.43E+02
1.04E+02
1.24E+02
8.37E+00
1.47E+02
1.01E+02
1.16E+02
4.25E+00
1.27E+02
1.04E+02
1.27E+02 1.30E+02 1.25E+02 1.15E+02
8.18E+00 1.04E+01 8.50E+00 3.27E+00
1.50E+02 1.58E+02 1.48E+02 1.24E+02
1.05E+02 1.02E+02 1.02E+02 1.06E+02
1.00E+02 1.00E+02 9.80E+01 8.80E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
32
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Power Supply Rejection Ratio 2 @ +5V (dB)
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.14. Plot of Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose. The data show some
degradation with radiation, however the parameter remains within specification even after application of the
KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
33
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 2 @ +5V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.16E+02
1.27E+02
1.26E+02
1.36E+02
1.19E+02
1.28E+02
1.19E+02
1.16E+02
1.25E+02
1.38E+02
1.19E+02
1.12E+02
20
1.15E+02
1.22E+02
1.19E+02
1.19E+02
1.31E+02
1.11E+02
1.17E+02
1.18E+02
1.22E+02
1.20E+02
1.16E+02
1.13E+02
50
1.12E+02
1.18E+02
1.12E+02
1.13E+02
1.13E+02
1.20E+02
1.12E+02
1.14E+02
1.21E+02
1.13E+02
1.20E+02
1.13E+02
100
1.08E+02
1.18E+02
1.13E+02
1.11E+02
1.13E+02
1.08E+02
1.11E+02
1.08E+02
1.19E+02
1.11E+02
1.21E+02
1.09E+02
1.25E+02
8.12E+00
1.47E+02
1.03E+02
1.21E+02
6.10E+00
1.38E+02
1.04E+02
1.14E+02
2.65E+00
1.21E+02
1.06E+02
1.12E+02
3.76E+00
1.23E+02
1.02E+02
1.25E+02 1.18E+02 1.16E+02 1.11E+02
8.52E+00 4.13E+00 4.30E+00 4.49E+00
1.49E+02 1.29E+02 1.28E+02 1.24E+02
1.02E+02 1.06E+02 1.04E+02 9.90E+01
1.00E+02 1.00E+02 9.80E+01 8.80E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
34
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=open (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.15. Plot of Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
35
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=open (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.36E+03
1.08E+03
1.23E+03
1.48E+03
1.42E+03
1.29E+03
1.59E+03
1.29E+03
1.35E+03
1.31E+03
1.32E+03
1.53E+03
20
1.44E+03
1.12E+03
1.06E+03
1.10E+03
1.57E+03
1.01E+03
1.40E+03
1.04E+03
1.30E+03
1.04E+03
1.28E+03
1.30E+03
50
1.35E+03
1.67E+03
1.78E+03
1.99E+03
2.36E+03
1.30E+03
1.23E+03
1.26E+03
1.32E+03
1.25E+03
1.34E+03
1.22E+03
100
9.99E+02
1.12E+03
1.71E+03
1.42E+03
9.99E+02
9.99E+02
1.88E+03
1.51E+03
9.99E+02
1.03E+03
1.33E+03
1.46E+03
1.31E+03
1.62E+02
1.76E+03
8.70E+02
1.26E+03
2.33E+02
1.90E+03
6.19E+02
1.83E+03
3.76E+02
2.86E+03
7.98E+02
1.25E+03
3.10E+02
2.10E+03
4.00E+02
1.36E+03 1.16E+03 1.27E+03 1.28E+03
1.27E+02 1.79E+02 3.66E+01 3.97E+02
1.71E+03 1.65E+03 1.37E+03 2.37E+03
1.02E+03 6.68E+02 1.17E+03 1.95E+02
1.50E+02 1.50E+02 1.00E+02 5.00E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
36
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=open (V/mV)
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.16. Plot of Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
37
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.16. Raw data for Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=open (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.28E+03
1.09E+03
1.14E+03
1.21E+03
1.09E+03
1.34E+03
1.62E+03
1.14E+03
1.23E+03
1.23E+03
1.18E+03
1.44E+03
20
1.35E+03
1.38E+03
1.21E+03
1.43E+03
1.15E+03
1.40E+03
1.10E+03
1.13E+03
1.68E+03
1.35E+03
1.54E+03
1.27E+03
50
1.28E+03
1.28E+03
1.23E+03
1.19E+03
1.82E+03
1.68E+03
1.62E+03
1.85E+03
1.15E+03
1.35E+03
1.52E+03
1.34E+03
100
1.58E+03
9.99E+02
1.28E+03
9.99E+02
9.99E+02
1.78E+03
9.99E+02
2.04E+03
9.99E+02
1.90E+03
1.81E+03
1.21E+03
1.16E+03
8.35E+01
1.39E+03
9.32E+02
1.30E+03
1.21E+02
1.64E+03
9.71E+02
1.36E+03
2.59E+02
2.07E+03
6.51E+02
1.17E+03
2.58E+02
1.88E+03
4.64E+02
1.31E+03 1.33E+03 1.53E+03 1.54E+03
1.85E+02 2.34E+02 2.77E+02 5.06E+02
1.82E+03 1.98E+03 2.29E+03 2.93E+03
8.08E+02 6.90E+02 7.70E+02 1.57E+02
1.50E+02 1.50E+02 1.00E+02 5.00E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
38
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.17. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show
significant degradation with radiation, however the parameter remains within specification even after
application of the KTLs statistics. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
39
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.17. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.41E+03
2.31E+03
2.01E+03
1.88E+03
1.39E+03
1.46E+03
2.41E+03
1.82E+03
2.07E+03
1.71E+03
1.16E+03
1.23E+03
20
1.09E+03
1.28E+03
1.67E+03
9.69E+02
8.91E+02
1.28E+03
1.27E+03
1.71E+03
7.67E+02
1.31E+03
1.30E+03
1.75E+03
50
5.28E+02
5.10E+02
6.67E+02
4.45E+02
5.82E+02
4.83E+02
6.39E+02
7.65E+02
6.20E+02
6.35E+02
1.59E+03
1.32E+03
100
2.38E+02
2.54E+02
2.72E+02
2.23E+02
2.55E+02
2.13E+02
2.47E+02
2.42E+02
2.39E+02
2.00E+02
1.67E+03
1.35E+03
1.80E+03
3.96E+02
2.89E+03
7.12E+02
1.18E+03
3.10E+02
2.03E+03
3.31E+02
5.46E+02
8.32E+01
7.75E+02
3.18E+02
2.48E+02
1.87E+01
3.00E+02
1.97E+02
1.89E+03 1.27E+03 6.28E+02 2.28E+02
3.65E+02 3.34E+02 1.00E+02 2.04E+01
2.89E+03 2.18E+03 9.03E+02 2.84E+02
8.91E+02 3.50E+02 3.54E+02 1.72E+02
1.20E+02 1.20E+02 2.00E+01 1.00E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
40
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.18. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show
significant degradation with radiation, however the parameter remains within specification even after
application of the KTLs statistics. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
41
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.18. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.13E+03
1.66E+03
1.67E+03
1.98E+03
1.64E+03
1.87E+03
1.37E+03
1.35E+03
1.73E+03
1.40E+03
1.37E+03
1.04E+03
20
9.74E+02
1.38E+03
1.29E+03
1.04E+03
1.05E+03
1.07E+03
9.37E+02
1.09E+03
1.63E+03
1.29E+03
1.27E+03
1.19E+03
50
5.73E+02
6.34E+02
5.50E+02
6.06E+02
4.74E+02
4.35E+02
5.90E+02
4.91E+02
5.12E+02
4.90E+02
1.32E+03
1.22E+03
100
2.46E+02
2.46E+02
2.52E+02
2.43E+02
2.39E+02
1.79E+02
2.12E+02
2.10E+02
2.21E+02
2.17E+02
1.69E+03
1.19E+03
1.61E+03
3.09E+02
2.46E+03
7.68E+02
1.15E+03
1.77E+02
1.63E+03
6.64E+02
5.67E+02
6.10E+01
7.35E+02
4.00E+02
2.45E+02
4.51E+00
2.57E+02
2.33E+02
1.54E+03 1.20E+03 5.03E+02 2.08E+02
2.42E+02 2.72E+02 5.59E+01 1.67E+01
2.21E+03 1.95E+03 6.57E+02 2.54E+02
8.80E+02 4.58E+02 3.50E+02 1.62E+02
1.20E+02 1.20E+02 2.00E+01 1.00E+01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
42
Output Voltage Low 1 @ +5V RL=open (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.19. Plot of Output Voltage Low 1 @ +5V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
43
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.19. Raw data for Output Voltage Low 1 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
4.06E-03
4.62E-03
4.41E-03
4.55E-03
4.20E-03
4.94E-03
4.20E-03
4.30E-03
4.31E-03
4.04E-03
4.25E-03
4.63E-03
20
4.84E-03
4.46E-03
4.92E-03
5.02E-03
4.87E-03
4.43E-03
5.19E-03
4.62E-03
4.85E-03
4.90E-03
4.58E-03
4.58E-03
50
4.95E-03
5.04E-03
5.31E-03
5.32E-03
5.26E-03
5.34E-03
4.73E-03
5.22E-03
5.31E-03
5.27E-03
4.65E-03
4.57E-03
100
6.23E-03
5.91E-03
5.98E-03
5.90E-03
5.98E-03
6.77E-03
6.69E-03
6.45E-03
6.54E-03
6.64E-03
4.85E-03
4.63E-03
4.37E-03
2.35E-04
5.01E-03
3.72E-03
4.82E-03
2.14E-04
5.41E-03
4.24E-03
5.18E-03
1.70E-04
5.64E-03
4.71E-03
6.00E-03
1.34E-04
6.37E-03
5.63E-03
4.36E-03
4.80E-03
5.17E-03
6.62E-03
3.43E-04
2.89E-04
2.52E-04
1.26E-04
5.30E-03
5.59E-03
5.87E-03
6.96E-03
3.42E-03
4.01E-03
4.48E-03
6.27E-03
6.00E-03
6.00E-03
1.30E-02
2.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
44
Output Voltage Low 2 @ +5V RL=open (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.20. Plot of Output Voltage Low 2 @ +5V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
45
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.20. Raw data for Output Voltage Low 2 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
4.31E-03
4.38E-03
3.94E-03
5.00E-03
4.28E-03
4.08E-03
4.14E-03
3.86E-03
4.23E-03
4.33E-03
4.25E-03
3.96E-03
20
4.84E-03
4.75E-03
4.67E-03
4.62E-03
4.68E-03
4.78E-03
4.33E-03
4.48E-03
4.55E-03
4.46E-03
4.30E-03
4.19E-03
50
4.89E-03
5.34E-03
4.90E-03
5.22E-03
5.17E-03
5.90E-03
5.39E-03
5.02E-03
5.44E-03
5.37E-03
4.79E-03
4.20E-03
100
5.41E-03
5.74E-03
5.91E-03
5.64E-03
5.66E-03
6.72E-03
6.44E-03
6.17E-03
6.54E-03
6.69E-03
4.45E-03
4.30E-03
4.38E-03
3.85E-04
5.44E-03
3.33E-03
4.71E-03
8.53E-05
4.95E-03
4.48E-03
5.10E-03
2.01E-04
5.65E-03
4.55E-03
5.67E-03
1.81E-04
6.17E-03
5.18E-03
4.13E-03
4.52E-03
5.42E-03
6.51E-03
1.77E-04
1.66E-04
3.14E-04
2.22E-04
4.61E-03
4.97E-03
6.28E-03
7.12E-03
3.64E-03
4.07E-03
4.56E-03
5.90E-03
6.00E-03
6.00E-03
1.30E-02
2.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
46
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Output Voltage Low 1 @ +5V RL=2kΩ (V)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.21. Plot of Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
47
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.21. Raw data for Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.05E-03
9.70E-04
1.05E-03
8.80E-04
9.30E-04
8.90E-04
9.80E-04
8.70E-04
9.80E-04
1.04E-03
1.03E-03
9.00E-04
20
7.90E-04
9.00E-04
7.90E-04
8.80E-04
9.00E-04
9.80E-04
9.50E-04
1.04E-03
9.40E-04
1.05E-03
1.04E-03
8.10E-04
50
7.00E-04
9.00E-04
8.40E-04
8.60E-04
6.70E-04
7.50E-04
8.20E-04
9.30E-04
9.10E-04
7.70E-04
8.40E-04
8.20E-04
100
6.40E-04
6.80E-04
7.40E-04
6.70E-04
6.50E-04
6.20E-04
5.30E-04
6.90E-04
8.10E-04
8.10E-04
9.30E-04
9.20E-04
9.76E-04
7.47E-05
1.18E-03
7.71E-04
8.52E-04
5.72E-05
1.01E-03
6.95E-04
7.94E-04
1.02E-04
1.07E-03
5.13E-04
6.76E-04
3.91E-05
7.83E-04
5.69E-04
9.52E-04
9.92E-04
8.36E-04
6.92E-04
7.05E-05
5.07E-05
8.11E-05
1.22E-04
1.15E-03
1.13E-03
1.06E-03
1.03E-03
7.59E-04
8.53E-04
6.14E-04
3.58E-04
2.00E-03
2.00E-03
2.00E-03
2.00E-03
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
48
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Output Voltage Low 2 @ +5V RL=2kΩ (V)
2.50E-03
2.00E-03
1.50E-03
1.00E-03
5.00E-04
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.22. Plot of Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
49
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.22. Raw data for Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
7.50E-04
7.80E-04
9.10E-04
9.80E-04
8.30E-04
9.60E-04
8.60E-04
1.03E-03
1.00E-03
6.80E-04
9.40E-04
9.20E-04
20
9.30E-04
6.80E-04
9.80E-04
8.60E-04
9.20E-04
6.60E-04
8.00E-04
8.90E-04
8.20E-04
8.20E-04
8.90E-04
8.30E-04
50
9.10E-04
5.90E-04
9.60E-04
9.30E-04
8.40E-04
9.10E-04
9.20E-04
9.20E-04
9.20E-04
8.50E-04
9.80E-04
9.10E-04
100
7.50E-04
7.80E-04
6.00E-04
7.50E-04
7.00E-04
7.00E-04
8.70E-04
8.40E-04
7.60E-04
6.10E-04
8.40E-04
6.90E-04
8.50E-04
9.46E-05
1.11E-03
5.91E-04
8.74E-04
1.17E-04
1.19E-03
5.54E-04
8.46E-04
1.50E-04
1.26E-03
4.35E-04
7.16E-04
7.09E-05
9.10E-04
5.22E-04
9.06E-04
7.98E-04
9.04E-04
7.56E-04
1.42E-04
8.44E-05
3.05E-05
1.05E-04
1.29E-03
1.03E-03
9.88E-04
1.05E-03
5.17E-04
5.67E-04
8.20E-04
4.67E-04
2.00E-03
2.00E-03
2.00E-03
2.00E-03
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
50
Output Voltage Low 1 @ +5V IL=100uA (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.80E-01
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.23. Plot of Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
51
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.23. Raw data for Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +5V IL=100uA (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
8.66E-02
8.77E-02
8.63E-02
8.74E-02
8.88E-02
8.84E-02
8.71E-02
8.54E-02
8.55E-02
8.62E-02
8.71E-02
8.88E-02
20
8.94E-02
9.10E-02
8.93E-02
9.05E-02
9.17E-02
9.18E-02
8.96E-02
8.83E-02
8.91E-02
8.94E-02
8.83E-02
8.95E-02
50
9.42E-02
9.49E-02
9.29E-02
9.42E-02
9.63E-02
9.63E-02
9.39E-02
9.27E-02
9.37E-02
9.35E-02
8.83E-02
8.87E-02
100
1.01E-01
1.02E-01
1.00E-01
1.02E-01
1.02E-01
1.04E-01
1.01E-01
1.00E-01
1.01E-01
1.01E-01
8.78E-02
8.88E-02
8.74E-02
1.00E-03
9.01E-02
8.46E-02
9.04E-02
1.03E-03
9.32E-02
8.76E-02
9.45E-02
1.25E-03
9.79E-02
9.10E-02
1.02E-01
9.23E-04
1.04E-01
9.90E-02
8.65E-02
8.97E-02
9.40E-02
1.02E-01
1.25E-03
1.28E-03
1.37E-03
1.60E-03
8.99E-02
9.32E-02
9.78E-02
1.06E-01
8.31E-02
8.61E-02
9.03E-02
9.72E-02
1.30E-01
1.30E-01
1.50E-01
1.60E-01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
52
Output Voltage Low 2 @ +5V IL=100uA (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.80E-01
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.24. Plot of Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
53
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.24. Raw data for Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +5V IL=100uA (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
8.45E-02
8.54E-02
8.38E-02
8.46E-02
8.65E-02
8.64E-02
8.67E-02
8.19E-02
8.17E-02
8.56E-02
8.50E-02
8.78E-02
20
8.69E-02
8.78E-02
8.72E-02
8.71E-02
8.89E-02
8.92E-02
8.95E-02
8.41E-02
8.50E-02
8.90E-02
8.55E-02
8.81E-02
50
9.11E-02
9.18E-02
9.12E-02
9.14E-02
9.38E-02
9.40E-02
9.38E-02
8.85E-02
8.94E-02
9.34E-02
8.55E-02
8.80E-02
100
9.78E-02
9.88E-02
9.76E-02
9.81E-02
1.01E-01
1.01E-01
1.01E-01
9.67E-02
9.64E-02
1.01E-01
8.57E-02
8.78E-02
8.49E-02
1.02E-03
8.77E-02
8.21E-02
8.76E-02
8.04E-04
8.98E-02
8.54E-02
9.18E-02
1.11E-03
9.49E-02
8.88E-02
9.86E-02
1.32E-03
1.02E-01
9.50E-02
8.45E-02
8.73E-02
9.18E-02
9.93E-02
2.48E-03
2.58E-03
2.63E-03
2.50E-03
9.13E-02
9.44E-02
9.90E-02
1.06E-01
7.77E-02
8.03E-02
8.46E-02
9.24E-02
1.30E-01
1.30E-01
1.50E-01
1.60E-01
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
54
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +5V RL=open (V)
4.40E+00
4.38E+00
4.36E+00
4.34E+00
4.32E+00
4.30E+00
4.28E+00
4.26E+00
4.24E+00
4.22E+00
4.20E+00
4.18E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.25. Plot of Output Voltage High 1 @ +5V RL=open (V) versus total dose. The data show significant
degradation with radiation at the 100krad(Si) read point, however the parameter remains within specification
even after application of the KTLs statistics. Note that this part is only guaranteed by the manufacturer to
75krad(Si). The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
55
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.25. Raw data for Output Voltage High 1 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +5V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.36E+00
4.36E+00
4.35E+00
4.35E+00
4.36E+00
4.36E+00
4.35E+00
4.35E+00
4.36E+00
4.35E+00
4.36E+00
4.36E+00
20
4.37E+00
4.36E+00
4.36E+00
4.36E+00
4.37E+00
4.37E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
4.36E+00
50
4.38E+00
4.38E+00
4.37E+00
4.38E+00
4.38E+00
4.38E+00
4.37E+00
4.38E+00
4.38E+00
4.37E+00
4.36E+00
4.36E+00
100
4.39E+00
4.31E+00
4.38E+00
4.38E+00
4.34E+00
4.38E+00
4.27E+00
4.39E+00
4.39E+00
4.39E+00
4.36E+00
4.36E+00
4.35E+00
3.70E-03
4.36E+00
4.34E+00
4.36E+00
4.47E-03
4.38E+00
4.35E+00
4.38E+00
6.11E-03
4.39E+00
4.36E+00
4.36E+00
3.48E-02
4.46E+00
4.27E+00
4.35E+00 4.36E+00 4.38E+00 4.36E+00
1.79E-03
2.74E-03
5.76E-03
5.38E-02
4.36E+00 4.37E+00 4.39E+00 4.51E+00
4.35E+00 4.36E+00 4.36E+00 4.21E+00
4.20E+00 4.20E+00 4.20E+00 4.20E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
56
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +5V RL=open (V)
4.50E+00
4.45E+00
4.40E+00
4.35E+00
4.30E+00
4.25E+00
4.20E+00
4.15E+00
4.10E+00
4.05E+00
4.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.26. Plot of Output Voltage High 2 @ +5V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
57
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.26. Raw data for Output Voltage High 2 @ +5V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +5V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.35E+00
4.34E+00
4.34E+00
4.34E+00
4.35E+00
4.34E+00
4.35E+00
4.34E+00
4.34E+00
4.35E+00
4.34E+00
4.35E+00
20
4.36E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.35E+00
4.36E+00
4.35E+00
4.35E+00
4.36E+00
4.35E+00
4.36E+00
50
4.37E+00
4.36E+00
4.35E+00
4.36E+00
4.37E+00
4.37E+00
4.37E+00
4.36E+00
4.36E+00
4.37E+00
4.35E+00
4.36E+00
100
4.39E+00
4.39E+00
4.38E+00
4.39E+00
4.39E+00
4.39E+00
4.39E+00
4.39E+00
4.39E+00
4.39E+00
4.35E+00
4.35E+00
4.34E+00
4.27E-03
4.36E+00
4.33E+00
4.35E+00
4.44E-03
4.36E+00
4.34E+00
4.36E+00
5.07E-03
4.38E+00
4.35E+00
4.39E+00
3.11E-03
4.40E+00
4.38E+00
4.34E+00 4.35E+00 4.36E+00 4.39E+00
3.56E-03
3.65E-03
3.49E-03
2.41E-03
4.35E+00 4.36E+00 4.37E+00 4.40E+00
4.34E+00 4.34E+00 4.35E+00 4.38E+00
4.20E+00 4.20E+00 4.20E+00 4.20E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
58
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +5V RL=2kΩ (V)
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.27. Plot of Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose. The data show significant
degradation with radiation at the 100krad(Si) read point, however the parameter remains within specification
even after application of the KTLs statistics. Note that this part is only guaranteed by the manufacturer to
75krad(Si). The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
59
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.27. Raw data for Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +5V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.91E+00
3.89E+00
3.89E+00
3.89E+00
3.89E+00
3.89E+00
3.91E+00
3.92E+00
3.92E+00
3.91E+00
3.89E+00
3.91E+00
20
3.91E+00
3.89E+00
3.89E+00
3.89E+00
3.89E+00
3.89E+00
3.91E+00
3.91E+00
3.91E+00
3.90E+00
3.89E+00
3.91E+00
50
3.90E+00
3.88E+00
3.88E+00
3.88E+00
3.88E+00
3.88E+00
3.90E+00
3.91E+00
3.91E+00
3.90E+00
3.90E+00
3.91E+00
100
3.89E+00
3.87E+00
3.87E+00
3.87E+00
3.87E+00
3.79E+00
3.89E+00
3.90E+00
3.90E+00
3.89E+00
3.90E+00
3.91E+00
3.90E+00
8.58E-03
3.92E+00
3.87E+00
3.89E+00
9.06E-03
3.92E+00
3.87E+00
3.89E+00
8.90E-03
3.91E+00
3.86E+00
3.88E+00
9.84E-03
3.90E+00
3.85E+00
3.91E+00 3.90E+00 3.90E+00 3.87E+00
1.20E-02
1.14E-02
1.24E-02
4.52E-02
3.94E+00 3.94E+00 3.93E+00 4.00E+00
3.88E+00 3.87E+00 3.86E+00 3.75E+00
3.50E+00 3.50E+00 3.50E+00 3.50E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
60
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +5V RL=2kΩ (V)
4.00E+00
3.95E+00
3.90E+00
3.85E+00
3.80E+00
3.75E+00
3.70E+00
3.65E+00
3.60E+00
3.55E+00
3.50E+00
3.45E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.28. Plot of Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
61
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.28. Raw data for Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +5V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
3.95E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.93E+00
3.94E+00
3.96E+00
3.95E+00
3.95E+00
3.93E+00
3.94E+00
20
3.94E+00
3.92E+00
3.92E+00
3.93E+00
3.92E+00
3.92E+00
3.94E+00
3.95E+00
3.95E+00
3.94E+00
3.93E+00
3.94E+00
50
3.94E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.92E+00
3.93E+00
3.94E+00
3.94E+00
3.93E+00
3.94E+00
3.94E+00
100
3.93E+00
3.91E+00
3.91E+00
3.91E+00
3.91E+00
3.90E+00
3.92E+00
3.93E+00
3.93E+00
3.92E+00
3.93E+00
3.94E+00
3.93E+00
7.95E-03
3.95E+00
3.91E+00
3.93E+00
8.61E-03
3.95E+00
3.90E+00
3.92E+00
8.61E-03
3.94E+00
3.90E+00
3.91E+00
9.34E-03
3.94E+00
3.89E+00
3.95E+00 3.94E+00 3.93E+00 3.92E+00
1.07E-02
1.05E-02
1.09E-02
1.16E-02
3.97E+00 3.97E+00 3.96E+00 3.95E+00
3.92E+00 3.91E+00 3.90E+00 3.89E+00
3.50E+00 3.50E+00 3.50E+00 3.50E+00
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
62
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Positive Slew Rate 1 @ +5V (V/us)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.29. Plot of Positive Slew Rate 1 @ +5V (V/us) versus total dose. The data show significant change
with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
63
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.29. Raw data for Positive Slew Rate 1 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 1 @ +5V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.50E-02
8.30E-02
8.60E-02
8.20E-02
7.80E-02
8.00E-02
8.40E-02
8.90E-02
8.90E-02
8.30E-02
8.20E-02
7.90E-02
20
8.10E-02
7.80E-02
8.20E-02
7.80E-02
7.40E-02
7.60E-02
7.90E-02
8.50E-02
8.40E-02
7.80E-02
8.10E-02
7.90E-02
50
7.60E-02
7.40E-02
7.60E-02
7.20E-02
6.80E-02
7.00E-02
7.40E-02
7.90E-02
7.80E-02
7.20E-02
8.20E-02
8.00E-02
100
8.90E-02
7.10E-02
7.50E-02
6.20E-02
6.00E-02
5.60E-02
6.20E-02
8.70E-02
7.10E-02
6.10E-02
8.20E-02
8.00E-02
8.28E-02
3.11E-03
9.13E-02
7.43E-02
7.86E-02
3.13E-03
8.72E-02
7.00E-02
7.32E-02
3.35E-03
8.24E-02
6.40E-02
7.14E-02
1.16E-02
1.03E-01
3.95E-02
8.50E-02
8.04E-02
7.46E-02
6.74E-02
3.94E-03
3.91E-03
3.85E-03
1.22E-02
9.58E-02
9.11E-02
8.51E-02
1.01E-01
7.42E-02
6.97E-02
6.41E-02
3.39E-02
4.00E-02
4.00E-02
2.00E-02
1.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
64
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Positive Slew Rate 2 @ +5V (V/us)
9.00E-02
8.00E-02
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.30. Plot of Positive Slew Rate 2 @ +5V (V/us) versus total dose. The data show significant change
with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
65
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.30. Raw data for Positive Slew Rate 2 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 2 @ +5V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
8.50E-02
8.30E-02
8.60E-02
8.20E-02
7.80E-02
8.10E-02
8.40E-02
9.00E-02
8.90E-02
8.40E-02
8.10E-02
7.90E-02
20
8.10E-02
7.90E-02
8.20E-02
7.80E-02
7.50E-02
7.60E-02
8.00E-02
8.60E-02
8.40E-02
7.90E-02
8.10E-02
8.00E-02
50
7.60E-02
7.30E-02
7.70E-02
7.20E-02
7.00E-02
6.70E-02
7.40E-02
7.90E-02
7.70E-02
7.30E-02
8.20E-02
8.00E-02
100
8.20E-02
6.30E-02
7.80E-02
6.30E-02
6.10E-02
5.70E-02
7.10E-02
7.50E-02
7.00E-02
6.10E-02
8.20E-02
8.00E-02
8.28E-02
3.11E-03
9.13E-02
7.43E-02
7.90E-02
2.74E-03
8.65E-02
7.15E-02
7.36E-02
2.88E-03
8.15E-02
6.57E-02
6.94E-02
9.81E-03
9.63E-02
4.25E-02
8.56E-02
8.10E-02
7.40E-02
6.68E-02
3.78E-03
4.00E-03
4.58E-03
7.50E-03
9.60E-02
9.20E-02
8.66E-02
8.74E-02
7.52E-02
7.00E-02
6.14E-02
4.62E-02
4.00E-02
4.00E-02
2.00E-02
1.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
66
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Slew Rate 1 @ +5V (V/us)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.31. Plot of Negative Slew Rate 1 @ +5V (V/us) versus total dose. The data show significant change
with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
67
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.31. Raw data for Negative Slew Rate 1 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 1 @ +5V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.20E-02
-5.10E-02
-5.30E-02
-5.10E-02
-4.80E-02
-4.90E-02
-5.10E-02
-5.50E-02
-5.40E-02
-5.20E-02
-5.00E-02
-4.80E-02
20
-4.90E-02
-4.90E-02
-5.00E-02
-4.80E-02
-4.70E-02
-4.60E-02
-4.90E-02
-5.40E-02
-5.20E-02
-4.90E-02
-4.90E-02
-5.00E-02
50
-3.90E-02
-4.70E-02
-4.80E-02
-4.50E-02
-4.30E-02
-4.30E-02
-4.80E-02
-5.10E-02
-4.90E-02
-4.70E-02
-5.10E-02
-4.80E-02
100
-4.00E-02
-3.90E-02
-4.00E-02
-3.90E-02
-3.60E-02
-3.30E-02
-3.70E-02
-4.20E-02
-4.00E-02
-3.80E-02
-5.00E-02
-4.80E-02
-5.10E-02
1.87E-03
-4.59E-02
-5.61E-02
-4.86E-02
1.14E-03
-4.55E-02
-5.17E-02
-4.44E-02
3.58E-03
-3.46E-02
-5.42E-02
-3.88E-02
1.64E-03
-3.43E-02
-4.33E-02
-5.22E-02 -5.00E-02 -4.76E-02 -3.80E-02
2.39E-03
3.08E-03
2.97E-03
3.39E-03
-4.57E-02 -4.15E-02 -3.95E-02 -2.87E-02
-5.87E-02 -5.85E-02 -5.57E-02 -4.73E-02
-4.00E-02 -4.00E-02 -2.00E-02 -1.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
68
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Slew Rate 2 @ +5V (V/us)
0.00E+00
-1.00E-02
-2.00E-02
-3.00E-02
-4.00E-02
-5.00E-02
-6.00E-02
0
10
20
30
40
50
60
70
80
90
Total Dose (krad(Si))
Figure 5.32. Plot of Negative Slew Rate 2 @ +5V (V/us) versus total dose. The data show significant change
with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
69
100
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.32. Raw data for Negative Slew Rate 2 @ +5V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 2 @ +5V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-5.20E-02
-5.10E-02
-5.40E-02
-5.10E-02
-4.90E-02
-5.00E-02
-5.10E-02
-5.50E-02
-5.50E-02
-5.10E-02
-5.00E-02
-4.90E-02
20
-4.90E-02
-4.80E-02
-5.10E-02
-4.80E-02
-4.50E-02
-4.70E-02
-4.90E-02
-5.40E-02
-5.30E-02
-4.80E-02
-5.00E-02
-5.00E-02
50
-4.70E-02
-4.50E-02
-4.70E-02
-4.60E-02
-4.30E-02
-4.40E-02
-4.70E-02
-5.20E-02
-5.20E-02
-4.60E-02
-5.20E-02
-4.90E-02
100
-4.10E-02
-3.90E-02
-4.10E-02
-3.90E-02
-3.60E-02
-3.50E-02
-3.80E-02
-4.10E-02
-4.10E-02
-3.80E-02
-5.10E-02
-4.90E-02
-5.14E-02
1.82E-03
-4.64E-02
-5.64E-02
-4.82E-02
2.17E-03
-4.23E-02
-5.41E-02
-4.56E-02
1.67E-03
-4.10E-02
-5.02E-02
-3.92E-02
2.05E-03
-3.36E-02
-4.48E-02
-5.24E-02 -5.02E-02 -4.82E-02 -3.86E-02
2.41E-03
3.11E-03
3.63E-03
2.51E-03
-4.58E-02 -4.17E-02 -3.82E-02 -3.17E-02
-5.90E-02 -5.87E-02 -5.82E-02 -4.55E-02
-4.00E-02 -4.00E-02 -2.00E-02 -1.00E-02
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
70
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Positive Supply Current @+15V (A)
2.50E-04
2.00E-04
1.50E-04
1.00E-04
5.00E-05
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.33. Plot of Positive Supply Current @ +15V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
71
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.33. Raw data for Positive Supply Current @ +15V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.04E-04
9.70E-05
1.09E-04
1.02E-04
9.60E-05
1.03E-04
1.04E-04
1.06E-04
1.07E-04
1.00E-04
1.03E-04
9.70E-05
20
9.70E-05
1.01E-04
1.00E-04
9.70E-05
9.70E-05
8.80E-05
1.05E-04
1.03E-04
1.01E-04
9.70E-05
9.80E-05
9.50E-05
50
9.50E-05
8.40E-05
9.70E-05
9.00E-05
8.70E-05
8.10E-05
8.70E-05
9.00E-05
9.30E-05
9.10E-05
9.90E-05
9.70E-05
100
7.50E-05
8.00E-05
7.90E-05
7.90E-05
6.80E-05
6.40E-05
7.90E-05
7.70E-05
7.20E-05
7.70E-05
1.00E-04
9.90E-05
200
4.90E-05
5.40E-05
6.30E-05
5.60E-05
4.60E-05
4.60E-05
4.80E-05
5.50E-05
5.50E-05
5.30E-05
9.70E-05
1.01E-04
1.02E-04
5.32E-06
1.16E-04
8.70E-05
9.84E-05
1.95E-06
1.04E-04
9.31E-05
9.06E-05
5.41E-06
1.05E-04
7.58E-05
7.62E-05
4.97E-06
8.98E-05
6.26E-05
5.36E-05
6.58E-06
7.16E-05
3.56E-05
1.04E-04
9.88E-05
8.84E-05
7.38E-05
5.14E-05
2.74E-06
6.72E-06
4.67E-06
6.06E-06
4.16E-06
1.12E-04
1.17E-04
1.01E-04
9.04E-05
6.28E-05
9.65E-05
8.04E-05
7.56E-05
5.72E-05
4.00E-05
2.00E-04
2.00E-04
2.00E-04
2.00E-04
2.00E-04
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
72
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Negative Supply Current @+15V (A)
0.00E+00
-5.00E-05
-1.00E-04
-1.50E-04
-2.00E-04
-2.50E-04
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.34. Plot of Negative Supply Current @ +15V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
73
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.34. Raw data for Negative Supply Current @ +15V (A) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
-1.02E-04
-1.00E-04
-1.08E-04
-1.04E-04
-9.80E-05
-9.80E-05
-1.03E-04
-1.08E-04
-1.09E-04
-1.03E-04
-1.01E-04
-9.60E-05
20
-9.50E-05
-9.50E-05
-1.04E-04
-9.90E-05
-9.30E-05
-9.20E-05
-9.70E-05
-1.04E-04
-1.02E-04
-9.50E-05
-1.01E-04
-9.60E-05
50
-8.70E-05
-8.80E-05
-9.40E-05
-8.80E-05
-8.40E-05
-8.10E-05
-8.70E-05
-9.30E-05
-9.20E-05
-8.60E-05
-1.02E-04
-9.80E-05
100
-7.80E-05
-7.50E-05
-8.10E-05
-7.60E-05
-7.30E-05
-6.60E-05
-7.30E-05
-7.70E-05
-7.70E-05
-7.20E-05
-1.02E-04
-9.70E-05
200
-5.50E-05
-5.40E-05
-5.70E-05
-5.60E-05
-5.20E-05
-4.50E-05
-5.10E-05
-5.40E-05
-5.40E-05
-4.80E-05
-1.02E-04
-9.80E-05
-1.02E-04
3.85E-06
-9.19E-05
-1.13E-04
-9.72E-05
4.38E-06
-8.52E-05
-1.09E-04
-8.82E-05
3.63E-06
-7.82E-05
-9.82E-05
-7.66E-05
3.05E-06
-6.82E-05
-8.50E-05
-5.48E-05
1.92E-06
-4.95E-05
-6.01E-05
-1.04E-04 -9.80E-05 -8.78E-05 -7.30E-05 -5.04E-05
4.44E-06
4.95E-06
4.87E-06
4.53E-06
3.91E-06
-9.20E-05 -8.44E-05 -7.45E-05 -6.06E-05 -3.97E-05
-1.16E-04 -1.12E-04 -1.01E-04 -8.54E-05 -6.11E-05
-2.00E-04 -2.00E-04 -2.00E-04 -2.00E-04 -2.00E-04
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
74
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 1 @ +15V (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.35. Plot of Input Offset Voltage 1 @ +15V (V) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
75
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.35. Raw data for Input Offset Voltage 1 @ +15V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 1 @ +15V (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.61E-05
5.05E-05
5.01E-05
-2.38E-05
4.76E-05
8.17E-05
7.51E-05
-6.60E-05
2.91E-06
-9.29E-06
-6.87E-06
-3.42E-05
20
-3.96E-05
1.75E-05
1.23E-05
-4.32E-05
2.40E-05
5.62E-05
5.06E-05
-9.32E-05
-2.90E-05
-3.43E-05
-6.52E-06
-3.36E-05
50
-4.15E-05
3.93E-05
7.38E-06
-3.43E-05
2.78E-05
5.83E-05
5.39E-05
1.15E-04
-3.65E-05
-2.90E-05
-6.51E-06
-3.14E-05
100
-1.54E-05
7.77E-05
3.41E-05
1.74E-05
5.57E-05
1.09E-04
9.34E-05
1.14E-04
-1.39E-05
1.84E-05
-4.58E-06
-3.09E-05
200
8.71E-05
1.73E-04
1.02E-04
1.76E-04
1.81E-04
2.97E-04
2.55E-04
-2.54E-05
9.09E-05
1.97E-04
-9.05E-06
-3.26E-05
2.17E-05
3.81E-05
1.26E-04
-8.27E-05
-5.80E-06
3.28E-05
8.42E-05
-9.58E-05
-2.82E-07
3.63E-05
9.92E-05
-9.98E-05
3.39E-05
3.57E-05
1.32E-04
-6.40E-05
1.44E-04
4.54E-05
2.68E-04
1.94E-05
1.69E-05 -9.95E-06
3.23E-05
6.41E-05
1.63E-04
6.19E-05
6.31E-05
6.40E-05
5.81E-05
1.31E-04
1.87E-04
1.63E-04
2.08E-04
2.23E-04
5.21E-04
-1.53E-04 -1.83E-04 -1.43E-04 -9.51E-05 -1.95E-04
-3.50E-04 -3.50E-04 -6.50E-04 -1.00E-03 -1.00E-03
PASS
PASS
PASS
PASS
PASS
3.50E-04
3.50E-04
6.50E-04
1.00E-03
1.00E-03
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
76
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage 2 @ +15V (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.36. Plot of Input Offset Voltage 2 @ +15V (V) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
77
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.36. Raw data for Input Offset Voltage 2 @ +15V (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage 2 @ +15V (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-3.61E-05
-3.57E-05
-5.03E-05
1.32E-05
4.01E-05
-3.88E-05
-5.61E-05
-5.01E-05
1.27E-05
3.87E-05
-4.35E-05
-6.41E-05
20
-6.19E-05
-6.12E-05
-8.45E-05
-8.82E-06
1.62E-05
-7.00E-05
-8.15E-05
-7.82E-05
-7.37E-06
5.55E-06
-4.27E-05
-6.48E-05
50
-6.44E-05
-6.42E-05
-9.27E-05
1.29E-07
2.28E-05
-6.36E-05
-7.72E-05
-9.48E-05
7.25E-06
6.17E-06
-4.26E-05
-6.18E-05
100
-5.34E-05
-3.75E-05
-6.85E-05
3.99E-05
5.42E-05
-3.28E-05
-3.38E-05
-8.02E-05
1.17E-04
3.50E-05
-4.26E-05
-6.12E-05
200
3.99E-05
7.21E-05
3.24E-05
1.61E-04
1.88E-04
1.41E-04
1.05E-04
3.27E-06
5.05E-04
1.84E-04
-4.38E-05
-6.19E-05
-1.38E-05
3.86E-05
9.20E-05
-1.20E-04
-4.01E-05
4.20E-05
7.50E-05
-1.55E-04
-3.97E-05
4.88E-05
9.41E-05
-1.73E-04
-1.31E-05
5.62E-05
1.41E-04
-1.67E-04
9.85E-05
7.13E-05
2.94E-04
-9.69E-05
-1.87E-05 -4.63E-05 -4.44E-05
9.50E-07
1.88E-04
4.20E-05
4.19E-05
4.80E-05
7.66E-05
1.89E-04
9.65E-05
6.86E-05
8.71E-05
2.11E-04
7.07E-04
-1.34E-04 -1.61E-04 -1.76E-04 -2.09E-04 -3.32E-04
-3.50E-04 -3.50E-04 -6.50E-04 -1.00E-03 -1.00E-03
PASS
PASS
PASS
PASS
PASS
3.50E-04
3.50E-04
6.50E-04
1.00E-03
1.00E-03
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
78
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 1 @ +15V (A)
3.00E-08
2.00E-08
1.00E-08
0.00E+00
-1.00E-08
-2.00E-08
-3.00E-08
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.37. Plot of Input Offset Current 1 @ +15V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
79
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.37. Raw data for Input Offset Current 1 @ +15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 1 @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-9.00E-11
-5.00E-11
-2.10E-10
-1.10E-10
-8.00E-11
-8.00E-11
3.00E-11
-1.20E-10
-1.30E-10
1.00E-11
4.00E-11
2.00E-11
20
-5.00E-10
-8.00E-11
2.00E-11
-1.40E-10
-3.50E-10
-9.00E-11
-3.00E-11
-2.20E-10
0.00E+00
2.00E-11
-2.00E-11
6.00E-11
50
-4.90E-10
-4.00E-11
-1.40E-10
-1.40E-10
-1.40E-10
-1.30E-10
-2.80E-10
-1.60E-10
-1.00E-10
-6.00E-11
5.00E-11
-4.00E-11
100
-6.00E-10
-3.00E-11
-3.50E-10
-7.00E-11
-3.00E-10
-2.50E-10
-2.30E-10
-4.00E-10
-2.80E-10
-4.00E-11
5.00E-11
-3.00E-11
200
-5.30E-10
-3.90E-10
-4.20E-10
2.40E-10
4.00E-11
-4.50E-10
-5.30E-10
-5.40E-10
-9.90E-10
1.00E-10
3.00E-11
-3.00E-11
-1.08E-10
6.10E-11
5.92E-11
-2.75E-10
-2.10E-10
2.11E-10
3.69E-10
-7.89E-10
-1.90E-10
1.73E-10
2.85E-10
-6.65E-10
-2.70E-10
2.31E-10
3.64E-10
-9.04E-10
-2.12E-10
3.33E-10
7.01E-10
-1.13E-09
-5.80E-11 -6.40E-11 -1.46E-10 -2.40E-10 -4.82E-10
7.40E-11
9.66E-11
8.35E-11
1.30E-10
3.88E-10
1.45E-10
2.01E-10
8.31E-11
1.16E-10
5.83E-10
-2.61E-10 -3.29E-10 -3.75E-10 -5.96E-10 -1.55E-09
-8.00E-10 -2.00E-09 -1.30E-08 -2.30E-08 -2.30E-08
PASS
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
1.30E-08
2.30E-08
2.30E-08
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
80
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current 2 @ +15V (A)
3.00E-08
2.00E-08
1.00E-08
0.00E+00
-1.00E-08
-2.00E-08
-3.00E-08
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.38. Plot of Input Offset Current 2 @ +15V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
81
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.38. Raw data for Input Offset Current 2 @ +15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current 2 @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-4.00E-11
-3.00E-11
-1.00E-10
-2.00E-10
-1.80E-10
-3.00E-11
-1.30E-10
-1.20E-10
3.00E-11
-9.00E-11
-1.80E-10
-5.00E-11
20
1.80E-10
-2.60E-10
-6.00E-11
-7.00E-11
-6.00E-11
0.00E+00
-4.00E-11
-9.00E-11
-3.20E-10
-3.20E-10
-7.00E-11
3.00E-11
50
1.30E-10
-1.50E-10
-2.80E-10
-8.00E-11
-1.70E-10
-1.20E-10
-5.00E-11
-1.30E-10
-9.70E-10
-2.00E-10
-1.50E-10
-1.00E-11
100
-6.00E-11
-4.70E-10
-4.80E-10
-2.20E-10
-1.50E-10
-7.00E-11
2.00E-11
-1.40E-10
-2.90E-09
-1.20E-10
-1.40E-10
0.00E+00
200
0.00E+00
-4.20E-10
-1.70E-10
-1.50E-10
1.10E-10
-9.90E-10
-1.30E-10
-4.90E-10
-8.13E-09
-4.60E-10
-3.00E-11
2.00E-11
-1.10E-10
7.81E-11
1.04E-10
-3.24E-10
-5.40E-11
1.56E-10
3.74E-10
-4.82E-10
-1.10E-10
1.52E-10
3.07E-10
-5.27E-10
-2.76E-10
1.90E-10
2.46E-10
-7.98E-10
-1.26E-10
2.00E-10
4.23E-10
-6.75E-10
-6.80E-11 -1.54E-10 -2.94E-10 -6.42E-10 -2.04E-09
6.72E-11
1.55E-10
3.82E-10
1.26E-09
3.42E-09
1.16E-10
2.71E-10
7.52E-10
2.82E-09
7.33E-09
-2.52E-10 -5.79E-10 -1.34E-09 -4.11E-09 -1.14E-08
-8.00E-10 -2.00E-09 -1.30E-08 -2.30E-08 -2.30E-08
PASS
PASS
PASS
PASS
PASS
8.00E-10
2.00E-09
1.30E-08
2.30E-08
2.30E-08
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
82
Positive Input Bias Current 1 @ +15V (A)
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.39. Plot of Positive Input Bias Current 1 @ +15V (A) versus total dose. The data show significant
change with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
83
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.39. Raw data for Positive Input Bias Current 1 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 1 @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
7.28E-09
7.57E-09
8.01E-09
7.58E-09
7.85E-09
7.59E-09
8.23E-09
7.01E-09
7.32E-09
8.51E-09
7.66E-09
8.27E-09
20
1.08E-08
1.08E-08
1.16E-08
1.10E-08
1.16E-08
1.12E-08
1.21E-08
1.08E-08
1.15E-08
1.27E-08
7.72E-09
8.38E-09
50
1.68E-08
1.68E-08
1.77E-08
1.73E-08
1.77E-08
1.72E-08
1.83E-08
1.69E-08
1.82E-08
1.94E-08
7.55E-09
8.32E-09
100
2.74E-08
2.63E-08
2.82E-08
2.66E-08
2.73E-08
2.66E-08
2.89E-08
2.75E-08
2.85E-08
3.01E-08
7.64E-09
8.36E-09
200
4.58E-08
4.33E-08
4.61E-08
4.29E-08
4.41E-08
4.09E-08
4.62E-08
4.52E-08
4.58E-08
4.72E-08
7.65E-09
8.31E-09
7.66E-09
2.82E-10
8.43E-09
6.89E-09
1.11E-08
4.21E-10
1.23E-08
9.99E-09
1.72E-08
4.48E-10
1.85E-08
1.60E-08
2.72E-08
7.19E-10
2.91E-08
2.52E-08
4.44E-08
1.43E-09
4.84E-08
4.05E-08
7.73E-09
1.16E-08
1.80E-08
2.83E-08
4.50E-08
6.25E-10
7.73E-10
9.83E-10
1.32E-09
2.44E-09
9.45E-09
1.37E-08
2.07E-08
3.19E-08
5.17E-08
6.02E-09
9.51E-09
1.53E-08
2.47E-08
3.83E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.20E-07
1.20E-07
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
84
Positive Input Bias Current 2 @ +15V (A)
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.40. Plot of Positive Input Bias Current 2 @ +15V (A) versus total dose. The data show significant
change with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
85
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.40. Raw data for Positive Input Bias Current 2 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current 2 @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
7.60E-09
7.58E-09
8.05E-09
7.42E-09
7.94E-09
7.62E-09
8.40E-09
7.01E-09
7.35E-09
8.62E-09
7.63E-09
8.36E-09
20
1.14E-08
1.07E-08
1.17E-08
1.12E-08
1.16E-08
1.13E-08
1.21E-08
1.08E-08
1.14E-08
1.27E-08
7.62E-09
8.43E-09
50
1.77E-08
1.65E-08
1.77E-08
1.74E-08
1.77E-08
1.73E-08
1.85E-08
1.71E-08
1.83E-08
1.94E-08
7.64E-09
8.40E-09
100
2.83E-08
2.61E-08
2.83E-08
2.69E-08
2.72E-08
2.69E-08
2.90E-08
2.75E-08
2.89E-08
3.01E-08
7.56E-09
8.43E-09
200
4.67E-08
4.23E-08
4.64E-08
4.31E-08
4.37E-08
4.02E-08
4.59E-08
4.52E-08
4.72E-08
4.66E-08
7.64E-09
8.43E-09
7.72E-09
2.65E-10
8.45E-09
6.99E-09
1.13E-08
3.94E-10
1.24E-08
1.02E-08
1.74E-08
5.09E-10
1.88E-08
1.60E-08
2.73E-08
9.45E-10
2.99E-08
2.47E-08
4.44E-08
1.99E-09
4.99E-08
3.90E-08
7.80E-09
1.17E-08
1.81E-08
2.85E-08
4.50E-08
6.88E-10
7.69E-10
9.45E-10
1.28E-09
2.81E-09
9.69E-09
1.38E-08
2.07E-08
3.20E-08
5.27E-08
5.91E-09
9.55E-09
1.55E-08
2.49E-08
3.73E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.20E-07
1.20E-07
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
86
Negative Input Bias Current 1 @ +15V (A)
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.41. Plot of Negative Input Bias Current 1 @ +15V (A) versus total dose. The data show significant
change with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
87
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.41. Raw data for Negative Input Bias Current 1 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 1 @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
7.45E-09
7.49E-09
8.21E-09
7.69E-09
7.95E-09
7.76E-09
8.33E-09
7.26E-09
7.37E-09
8.48E-09
7.58E-09
8.32E-09
20
1.12E-08
1.09E-08
1.16E-08
1.14E-08
1.20E-08
1.13E-08
1.22E-08
1.10E-08
1.16E-08
1.28E-08
7.66E-09
8.31E-09
50
1.75E-08
1.67E-08
1.79E-08
1.74E-08
1.80E-08
1.76E-08
1.87E-08
1.72E-08
1.84E-08
1.95E-08
7.73E-09
8.35E-09
100
2.80E-08
2.65E-08
2.86E-08
2.70E-08
2.76E-08
2.71E-08
2.93E-08
2.80E-08
2.88E-08
2.99E-08
7.69E-09
8.43E-09
200
4.66E-08
4.40E-08
4.64E-08
4.27E-08
4.41E-08
4.16E-08
4.67E-08
4.57E-08
4.67E-08
4.72E-08
7.65E-09
8.35E-09
7.76E-09
3.21E-10
8.64E-09
6.88E-09
1.14E-08
4.22E-10
1.25E-08
1.02E-08
1.75E-08
5.36E-10
1.90E-08
1.60E-08
2.76E-08
8.27E-10
2.98E-08
2.53E-08
4.48E-08
1.71E-09
4.95E-08
4.01E-08
7.84E-09
1.18E-08
1.83E-08
2.86E-08
4.56E-08
5.51E-10
7.20E-10
9.04E-10
1.08E-09
2.30E-09
9.35E-09
1.37E-08
2.08E-08
3.16E-08
5.19E-08
6.33E-09
9.79E-09
1.58E-08
2.56E-08
3.93E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.20E-07
1.20E-07
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
88
Negative Input Bias Current 2 @ +15V (A)
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.42. Plot of Negative Input Bias Current 2 @ +15V (A) versus total dose. The data show significant
change with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
89
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.42. Raw data for Negative Input Bias Current 2 @ +15V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current 2 @ +15V (A)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
7.52E-09
7.64E-09
8.19E-09
7.63E-09
8.06E-09
7.75E-09
8.53E-09
7.10E-09
7.43E-09
8.62E-09
7.75E-09
8.36E-09
20
1.13E-08
1.10E-08
1.17E-08
1.12E-08
1.18E-08
1.12E-08
1.22E-08
1.08E-08
1.18E-08
1.30E-08
7.79E-09
8.35E-09
50
1.76E-08
1.67E-08
1.80E-08
1.76E-08
1.79E-08
1.74E-08
1.87E-08
1.71E-08
1.91E-08
1.96E-08
7.66E-09
8.39E-09
100
2.85E-08
2.66E-08
2.88E-08
2.72E-08
2.76E-08
2.70E-08
2.92E-08
2.79E-08
3.18E-08
3.03E-08
7.73E-09
8.41E-09
200
4.69E-08
4.31E-08
4.66E-08
4.30E-08
4.38E-08
4.13E-08
4.63E-08
4.59E-08
5.54E-08
4.71E-08
7.76E-09
8.40E-09
7.81E-09
2.97E-10
8.62E-09
6.99E-09
1.14E-08
3.32E-10
1.23E-08
1.05E-08
1.76E-08
5.27E-10
1.90E-08
1.61E-08
2.77E-08
9.01E-10
3.02E-08
2.52E-08
4.47E-08
1.92E-09
4.99E-08
3.94E-08
7.89E-09
1.18E-08
1.84E-08
2.93E-08
4.72E-08
6.70E-10
8.27E-10
1.10E-09
1.89E-09
5.12E-09
9.72E-09
1.41E-08
2.14E-08
3.44E-08
6.12E-08
6.05E-09
9.52E-09
1.54E-08
2.41E-08
3.31E-08
-1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07
PASS
PASS
PASS
PASS
PASS
1.50E-08
2.00E-08
8.00E-08
1.20E-07
1.20E-07
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
90
Common Mode Rejection Ratio 1 @ +15V (dB)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.43. Plot of Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
91
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.43. Raw data for Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 1 @ +15V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.13E+02
1.06E+02
1.06E+02
1.06E+02
1.06E+02
1.09E+02
1.09E+02
1.08E+02
1.12E+02
1.07E+02
1.08E+02
1.08E+02
20
1.15E+02
1.05E+02
1.05E+02
1.05E+02
1.05E+02
1.07E+02
1.08E+02
1.06E+02
1.09E+02
1.05E+02
1.08E+02
1.09E+02
50
1.15E+02
1.04E+02
1.04E+02
1.04E+02
1.04E+02
1.05E+02
1.06E+02
1.04E+02
1.08E+02
1.04E+02
1.08E+02
1.08E+02
100
1.14E+02
1.03E+02
1.03E+02
1.04E+02
1.04E+02
1.04E+02
1.05E+02
1.04E+02
1.06E+02
1.04E+02
1.08E+02
1.09E+02
200
1.15E+02
1.05E+02
1.03E+02
1.04E+02
1.04E+02
1.05E+02
1.07E+02
1.04E+02
1.09E+02
1.06E+02
1.08E+02
1.08E+02
1.07E+02
2.83E+00
1.15E+02
9.97E+01
1.07E+02
4.63E+00
1.20E+02
9.43E+01
1.06E+02
4.85E+00
1.19E+02
9.29E+01
1.06E+02
4.45E+00
1.18E+02
9.33E+01
1.06E+02
4.99E+00
1.20E+02
9.26E+01
1.09E+02 1.07E+02 1.05E+02 1.04E+02 1.06E+02
1.83E+00 1.50E+00 1.38E+00
9.68E-01 1.64E+00
1.14E+02 1.11E+02 1.09E+02 1.07E+02 1.11E+02
1.04E+02 1.03E+02 1.02E+02 1.02E+02 1.02E+02
9.70E+01 9.40E+01 9.00E+01 8.60E+01 8.60E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
92
Common Mode Rejection Ratio 2 @ +15V (dB)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.44. Plot of Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
93
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.44. Raw data for Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio 2 @ +15V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.13E+02
1.08E+02
1.10E+02
1.09E+02
1.10E+02
1.09E+02
1.09E+02
1.16E+02
1.12E+02
1.09E+02
1.09E+02
1.12E+02
20
1.10E+02
1.07E+02
1.08E+02
1.07E+02
1.09E+02
1.06E+02
1.07E+02
1.12E+02
1.10E+02
1.06E+02
1.09E+02
1.11E+02
50
1.09E+02
1.05E+02
1.06E+02
1.06E+02
1.07E+02
1.05E+02
1.06E+02
1.09E+02
1.09E+02
1.05E+02
1.09E+02
1.12E+02
100
1.08E+02
1.04E+02
1.05E+02
1.05E+02
1.07E+02
1.03E+02
1.05E+02
1.08E+02
1.16E+02
1.04E+02
1.09E+02
1.12E+02
200
1.08E+02
1.05E+02
1.05E+02
1.05E+02
1.07E+02
1.05E+02
1.07E+02
1.08E+02
1.03E+02
1.06E+02
1.09E+02
1.12E+02
1.10E+02
1.75E+00
1.15E+02
1.05E+02
1.08E+02
1.37E+00
1.12E+02
1.04E+02
1.07E+02
1.45E+00
1.11E+02
1.03E+02
1.06E+02
1.47E+00
1.10E+02
1.02E+02
1.06E+02
1.59E+00
1.10E+02
1.01E+02
1.11E+02 1.08E+02 1.07E+02 1.07E+02 1.05E+02
3.11E+00 2.37E+00 2.24E+00 5.33E+00 1.88E+00
1.19E+02 1.15E+02 1.13E+02 1.22E+02 1.11E+02
1.02E+02 1.02E+02 1.01E+02 9.26E+01 1.00E+02
9.70E+01 9.40E+01 9.00E+01 8.60E+01 8.60E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
94
Power Supply Rejection Ratio 1 @ +15V (dB)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.45. Plot of Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
95
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.45. Raw data for Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 1 @ +15V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.28E+02
1.40E+02
1.38E+02
1.18E+02
1.31E+02
1.29E+02
1.28E+02
1.30E+02
1.33E+02
1.22E+02
1.20E+02
1.27E+02
20
1.22E+02
1.26E+02
1.32E+02
1.18E+02
1.26E+02
1.27E+02
1.28E+02
1.27E+02
1.38E+02
1.28E+02
1.18E+02
1.26E+02
50
1.24E+02
1.22E+02
1.40E+02
1.16E+02
1.28E+02
1.34E+02
1.35E+02
1.25E+02
1.38E+02
1.23E+02
1.20E+02
1.27E+02
100
1.26E+02
1.19E+02
1.39E+02
1.13E+02
1.21E+02
1.25E+02
1.30E+02
1.23E+02
1.29E+02
1.19E+02
1.21E+02
1.21E+02
200
1.24E+02
1.17E+02
1.23E+02
1.10E+02
1.18E+02
1.13E+02
1.22E+02
1.15E+02
1.14E+02
1.12E+02
1.20E+02
1.22E+02
1.31E+02
8.70E+00
1.55E+02
1.07E+02
1.25E+02
5.21E+00
1.39E+02
1.11E+02
1.26E+02
8.96E+00
1.50E+02
1.01E+02
1.24E+02
9.49E+00
1.50E+02
9.76E+01
1.18E+02
5.39E+00
1.33E+02
1.04E+02
1.28E+02 1.29E+02 1.31E+02 1.25E+02 1.15E+02
3.82E+00 4.64E+00 6.31E+00 4.57E+00 4.05E+00
1.39E+02 1.42E+02 1.48E+02 1.38E+02 1.27E+02
1.18E+02 1.17E+02 1.14E+02 1.12E+02 1.04E+02
1.00E+02 1.00E+02 9.80E+01 7.80E+01 7.80E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
96
Power Supply Rejection Ratio 2 @ +15V (dB)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
1.60E+02
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.46. Plot of Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
97
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.46. Raw data for Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio 2 @ +15V (dB)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.41E+02
1.38E+02
1.33E+02
1.34E+02
1.40E+02
1.38E+02
1.30E+02
1.28E+02
1.21E+02
1.29E+02
1.27E+02
1.25E+02
20
1.29E+02
1.43E+02
1.42E+02
1.37E+02
1.34E+02
1.28E+02
1.26E+02
1.40E+02
1.24E+02
1.25E+02
1.26E+02
1.28E+02
50
1.23E+02
1.32E+02
1.37E+02
1.28E+02
1.28E+02
1.20E+02
1.26E+02
1.35E+02
1.26E+02
1.22E+02
1.25E+02
1.28E+02
100
1.17E+02
1.27E+02
1.27E+02
1.21E+02
1.24E+02
1.15E+02
1.22E+02
1.20E+02
1.16E+02
1.17E+02
1.23E+02
1.28E+02
200
1.14E+02
1.15E+02
1.13E+02
1.13E+02
1.19E+02
1.10E+02
1.15E+02
1.12E+02
1.08E+02
1.11E+02
1.30E+02
1.27E+02
1.37E+02
3.53E+00
1.47E+02
1.27E+02
1.37E+02
5.74E+00
1.53E+02
1.21E+02
1.30E+02
5.42E+00
1.45E+02
1.15E+02
1.23E+02
4.34E+00
1.35E+02
1.12E+02
1.15E+02
2.34E+00
1.21E+02
1.08E+02
1.29E+02 1.28E+02 1.26E+02 1.18E+02 1.11E+02
6.03E+00 6.57E+00 5.60E+00 2.96E+00 2.61E+00
1.46E+02 1.46E+02 1.41E+02 1.26E+02 1.18E+02
1.13E+02 1.10E+02 1.10E+02 1.10E+02 1.04E+02
1.00E+02 1.00E+02 9.80E+01 7.80E+01 7.80E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
98
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
3.50E+04
3.00E+04
2.50E+04
2.00E+04
1.50E+04
1.00E+04
5.00E+03
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.47. Plot of Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show
significant change with radiation, however the parameter remains within specification even after application of
the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
99
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.47. Raw data for Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
2.56E+04
2.39E+04
2.99E+04
2.19E+04
2.90E+04
3.56E+04
3.14E+04
3.18E+04
2.70E+04
3.25E+04
2.52E+04
3.22E+04
20
1.90E+04
3.53E+04
3.34E+04
3.00E+04
2.02E+04
3.21E+04
2.89E+04
3.23E+04
3.41E+04
2.14E+04
3.03E+04
2.77E+04
50
3.29E+04
3.25E+04
2.69E+04
2.56E+04
2.46E+04
2.07E+04
2.41E+04
2.89E+04
2.71E+04
2.39E+04
3.23E+04
3.52E+04
100
2.21E+04
1.40E+04
2.37E+04
3.36E+04
2.03E+04
2.43E+04
1.11E+04
2.59E+04
1.89E+04
1.79E+04
2.94E+04
3.51E+04
200
2.56E+04
2.00E+04
8.16E+03
1.95E+04
1.99E+04
1.07E+04
1.03E+04
2.32E+04
1.96E+04
2.20E+04
2.97E+04
2.64E+04
2.60E+04
3.39E+03
3.53E+04
1.68E+04
2.76E+04
7.54E+03
4.83E+04
6.90E+03
2.85E+04
3.92E+03
3.93E+04
1.78E+04
2.28E+04
7.12E+03
4.23E+04
3.25E+03
1.86E+04
6.38E+03
3.61E+04
1.15E+03
3.16E+04 2.98E+04 2.50E+04 1.96E+04 1.72E+04
3.06E+03 5.00E+03 3.16E+03 5.86E+03 6.21E+03
4.00E+04 4.35E+04 3.36E+04 3.57E+04 3.42E+04
2.33E+04 1.60E+04 1.63E+04 3.55E+03 1.29E+02
1.00E+03 1.00E+03 4.00E+02 5.00E+01 5.00E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
100
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
4.50E+04
4.00E+04
3.50E+04
3.00E+04
2.50E+04
2.00E+04
1.50E+04
1.00E+04
5.00E+03
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.48. Plot of Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show
significant change with radiation, however the parameter remains within specification even after application of
the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
101
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.48. Raw data for Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
4.04E+04
4.00E+04
4.05E+04
5.02E+04
2.27E+04
3.53E+04
3.12E+04
3.18E+04
3.20E+04
2.92E+04
3.96E+04
2.99E+04
20
2.57E+04
3.62E+04
2.56E+04
2.97E+04
2.15E+04
3.33E+04
3.14E+04
3.72E+04
3.55E+04
1.92E+04
3.86E+04
4.10E+04
50
2.88E+04
3.29E+04
3.65E+04
3.05E+04
2.50E+04
2.56E+04
1.76E+04
3.58E+04
2.66E+04
4.35E+04
3.34E+04
3.99E+04
100
1.61E+04
2.56E+04
1.53E+04
1.57E+04
2.15E+04
2.89E+04
3.21E+04
3.21E+04
1.71E+04
2.07E+04
3.63E+04
3.04E+04
200
3.06E+04
2.34E+04
3.17E+04
1.88E+04
2.79E+04
1.96E+04
3.06E+04
2.01E+04
1.89E+04
2.40E+04
1.00E+05
1.00E+05
3.88E+04
9.96E+03
6.61E+04
1.14E+04
2.77E+04
5.56E+03
4.30E+04
1.25E+04
3.07E+04
4.33E+03
4.26E+04
1.89E+04
1.89E+04
4.53E+03
3.13E+04
6.45E+03
2.65E+04
5.36E+03
4.12E+04
1.18E+04
3.19E+04 3.13E+04 2.98E+04 2.62E+04 2.26E+04
2.22E+03 7.11E+03 1.00E+04 6.91E+03 4.88E+03
3.80E+04 5.08E+04 5.72E+04 4.52E+04 3.60E+04
2.58E+04 1.18E+04 2.40E+03 7.23E+03 9.24E+03
1.00E+03 1.00E+03 4.00E+02 5.00E+01 5.00E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
102
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.49. Plot of Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show
significant change with radiation, however the parameter remains within specification even after application of
the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
103
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.49. Raw data for Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.55E+03
2.12E+03
2.38E+03
1.62E+03
1.97E+03
1.99E+03
2.13E+03
1.78E+03
1.66E+03
1.78E+03
1.64E+03
1.64E+03
20
1.39E+03
1.87E+03
2.37E+03
1.50E+03
1.81E+03
1.81E+03
1.90E+03
1.70E+03
1.60E+03
1.59E+03
1.66E+03
1.61E+03
50
1.08E+03
1.45E+03
1.78E+03
1.15E+03
1.36E+03
1.39E+03
1.54E+03
1.30E+03
1.26E+03
1.21E+03
1.67E+03
1.63E+03
100
6.64E+02
7.63E+02
9.51E+02
6.67E+02
8.02E+02
6.62E+02
7.97E+02
7.53E+02
7.41E+02
6.18E+02
1.63E+03
1.59E+03
200
2.56E+02
2.83E+02
3.29E+02
2.65E+02
2.93E+02
2.12E+02
2.68E+02
2.51E+02
2.39E+02
1.95E+02
1.57E+03
1.63E+03
1.93E+03
3.48E+02
2.88E+03
9.73E+02
1.79E+03
3.81E+02
2.83E+03
7.43E+02
1.36E+03
2.79E+02
2.13E+03
5.98E+02
7.69E+02
1.18E+02
1.09E+03
4.46E+02
2.85E+02
2.86E+01
3.63E+02
2.07E+02
1.87E+03 1.72E+03 1.34E+03 7.14E+02 2.33E+02
1.87E+02 1.38E+02 1.29E+02 7.27E+01 2.94E+01
2.38E+03 2.10E+03 1.70E+03 9.14E+02 3.14E+02
1.35E+03 1.34E+03 9.88E+02 5.15E+02 1.53E+02
3.00E+02 3.00E+02 1.20E+02 1.50E+01 1.50E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
104
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.50. Plot of Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show
significant change with radiation, however the parameter remains within specification even after application of
the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
105
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.50. Raw data for Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.33E+03
1.54E+03
1.61E+03
1.54E+03
1.48E+03
1.56E+03
1.47E+03
1.42E+03
1.50E+03
1.49E+03
1.50E+03
1.35E+03
20
1.21E+03
1.36E+03
1.42E+03
1.45E+03
1.36E+03
1.29E+03
1.26E+03
1.35E+03
1.36E+03
1.34E+03
1.46E+03
1.26E+03
50
9.40E+02
1.07E+03
1.15E+03
1.09E+03
1.03E+03
1.10E+03
1.06E+03
9.93E+02
1.05E+03
1.01E+03
1.48E+03
1.36E+03
100
6.20E+02
6.99E+02
7.25E+02
7.04E+02
6.76E+02
6.04E+02
6.84E+02
6.39E+02
5.99E+02
6.50E+02
1.43E+03
1.33E+03
200
2.79E+02
3.00E+02
2.94E+02
2.93E+02
2.66E+02
2.12E+02
2.58E+02
2.34E+02
1.89E+02
2.02E+02
1.48E+03
1.35E+03
1.50E+03
1.07E+02
1.79E+03
1.21E+03
1.36E+03
9.48E+01
1.62E+03
1.10E+03
1.05E+03
7.76E+01
1.27E+03
8.42E+02
6.85E+02
4.00E+01
7.94E+02
5.75E+02
2.86E+02
1.36E+01
3.23E+02
2.49E+02
1.49E+03 1.32E+03 1.04E+03 6.35E+02 2.19E+02
5.05E+01 4.27E+01 4.27E+01 3.50E+01 2.76E+01
1.63E+03 1.44E+03 1.16E+03 7.31E+02 2.95E+02
1.35E+03 1.20E+03 9.25E+02 5.39E+02 1.43E+02
3.00E+02 3.00E+02 1.20E+02 1.50E+01 1.50E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
106
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +15V RL=open (V)
1.44E+01
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.51. Plot of Output Voltage High 1 @ +15V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
107
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.51. Raw data for Output Voltage High 1 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +15V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
20
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
50
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
100
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
200
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
3.63E-03
1.42E+01
1.42E+01
1.42E+01
4.09E-03
1.42E+01
1.42E+01
1.42E+01
4.15E-03
1.42E+01
1.42E+01
1.42E+01
4.44E-03
1.42E+01
1.42E+01
1.42E+01
4.34E-03
1.42E+01
1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01
3.83E-03
3.83E-03
3.83E-03
4.60E-03
5.02E-03
1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
108
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +15V RL=open (V)
1.44E+01
1.42E+01
1.40E+01
1.38E+01
1.36E+01
1.34E+01
1.32E+01
1.30E+01
1.28E+01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.52. Plot of Output Voltage High 2 @ +15V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
109
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.52. Raw data for Output Voltage High 2 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +15V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.43E+01
1.43E+01
1.43E+01
1.42E+01
1.43E+01
20
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.43E+01
1.43E+01
1.42E+01
1.43E+01
50
1.43E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
1.42E+01
1.43E+01
1.43E+01
100
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
200
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.42E+01
1.43E+01
1.42E+01
3.49E-03
1.43E+01
1.42E+01
1.42E+01
4.00E-03
1.43E+01
1.42E+01
1.42E+01
3.71E-03
1.43E+01
1.42E+01
1.42E+01
4.53E-03
1.43E+01
1.42E+01
1.42E+01
4.88E-03
1.42E+01
1.42E+01
1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01
3.63E-03
3.11E-03
3.77E-03
3.85E-03
4.42E-03
1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.42E+01
1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01
1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
110
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 1 @ +15V RL=2kΩ (V)
1.40E+01
1.20E+01
1.00E+01
8.00E+00
6.00E+00
4.00E+00
2.00E+00
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.53. Plot of Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
111
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.53. Raw data for Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 1 @ +15V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
20
1.29E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
50
1.29E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
100
1.29E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
200
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
1.28E+01
1.29E+01
1.29E+01
1.29E+01
2.10E-02
1.29E+01
1.28E+01
1.28E+01
2.16E-02
1.29E+01
1.28E+01
1.28E+01
2.14E-02
1.29E+01
1.28E+01
1.28E+01
2.28E-02
1.29E+01
1.28E+01
1.28E+01
2.61E-02
1.29E+01
1.27E+01
1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01
3.50E-02
3.48E-02
3.54E-02
3.65E-02
3.65E-02
1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01
1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.27E+01
1.10E+01 1.10E+01 1.10E+01 1.00E+01 1.00E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
112
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Output Voltage High 2 @ +15V RL=2kΩ (V)
1.40E+01
1.20E+01
1.00E+01
8.00E+00
6.00E+00
4.00E+00
2.00E+00
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.54. Plot of Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
113
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.54. Raw data for Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage High 2 @ +15V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.30E+01
20
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.30E+01
50
1.30E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.30E+01
1.30E+01
1.29E+01
1.30E+01
100
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.30E+01
1.29E+01
1.29E+01
1.30E+01
200
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.29E+01
1.30E+01
1.29E+01
1.88E-02
1.30E+01
1.29E+01
1.29E+01
1.98E-02
1.30E+01
1.29E+01
1.29E+01
1.98E-02
1.30E+01
1.29E+01
1.29E+01
2.07E-02
1.30E+01
1.28E+01
1.29E+01
2.32E-02
1.29E+01
1.28E+01
1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.29E+01
2.82E-02
2.84E-02
2.90E-02
2.97E-02
2.96E-02
1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01
1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01
1.10E+01 1.10E+01 1.10E+01 1.00E+01 1.00E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
114
Output Voltage Low 1 @ +15V RL=open (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-1.28E+01
-1.30E+01
-1.32E+01
-1.34E+01
-1.36E+01
-1.38E+01
-1.40E+01
-1.42E+01
-1.44E+01
-1.46E+01
-1.48E+01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.55. Plot of Output Voltage Low 1 @ +15V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
115
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.55. Raw data for Output Voltage Low 1 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +15V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
20
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
50
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
100
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
200
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
1.95E-03
-1.46E+01
-1.46E+01
-1.46E+01
1.64E-03
-1.46E+01
-1.46E+01
-1.46E+01
1.48E-03
-1.46E+01
-1.46E+01
-1.46E+01
1.52E-03
-1.46E+01
-1.46E+01
-1.46E+01
2.19E-03
-1.46E+01
-1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
3.11E-03
2.70E-03
2.92E-03
2.88E-03
2.07E-03
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
116
Output Voltage Low 2 @ +15V RL=open (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
-1.28E+01
-1.30E+01
-1.32E+01
-1.34E+01
-1.36E+01
-1.38E+01
-1.40E+01
-1.42E+01
-1.44E+01
-1.46E+01
-1.48E+01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.56. Plot of Output Voltage Low 2 @ +15V RL=open (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
117
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.56. Raw data for Output Voltage Low 2 @ +15V RL=open (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +15V RL=open (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
20
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
50
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
100
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
200
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
-1.46E+01
1.64E-03
-1.46E+01
-1.46E+01
-1.46E+01
1.73E-03
-1.46E+01
-1.46E+01
-1.46E+01
1.92E-03
-1.46E+01
-1.46E+01
-1.46E+01
2.28E-03
-1.46E+01
-1.46E+01
-1.46E+01
1.64E-03
-1.46E+01
-1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
4.32E-03
4.49E-03
3.78E-03
4.51E-03
4.10E-03
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01
-1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
118
Output Voltage Low 1 @ +15V RL=2kΩ (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
0.00E+00
-2.00E+00
-4.00E+00
-6.00E+00
-8.00E+00
-1.00E+01
-1.20E+01
-1.40E+01
-1.60E+01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.57. Plot of Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
119
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.57. Raw data for Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 1 @ +15V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
20
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
50
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
100
-1.35E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
200
-1.35E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.36E+01
1.53E-02
-1.35E+01
-1.36E+01
-1.36E+01
1.51E-02
-1.35E+01
-1.36E+01
-1.36E+01
1.48E-02
-1.35E+01
-1.36E+01
-1.35E+01
1.43E-02
-1.35E+01
-1.36E+01
-1.35E+01
1.43E-02
-1.35E+01
-1.36E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01
3.94E-02
3.95E-02
3.95E-02
4.04E-02
3.93E-02
-1.35E+01 -1.35E+01 -1.35E+01 -1.34E+01 -1.34E+01
-1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.36E+01
-1.10E+01 -1.10E+01 -1.10E+01 -1.00E+01 -1.00E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
120
Output Voltage Low 2 @ +15V RL=2kΩ (V)
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
0.00E+00
-2.00E+00
-4.00E+00
-6.00E+00
-8.00E+00
-1.00E+01
-1.20E+01
-1.40E+01
-1.60E+01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.58. Plot of Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
121
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.58. Raw data for Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Low 2 @ +15V RL=2kΩ (V)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.37E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
20
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
50
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
100
-1.36E+01
-1.36E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
200
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.35E+01
-1.35E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.35E+01
-1.36E+01
-1.36E+01
-1.36E+01
1.41E-02
-1.36E+01
-1.36E+01
-1.36E+01
1.38E-02
-1.36E+01
-1.36E+01
-1.36E+01
1.39E-02
-1.35E+01
-1.36E+01
-1.36E+01
1.36E-02
-1.35E+01
-1.36E+01
-1.35E+01
1.36E-02
-1.35E+01
-1.36E+01
-1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01
3.84E-02
3.82E-02
3.79E-02
3.85E-02
3.71E-02
-1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.34E+01
-1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01
-1.10E+01 -1.10E+01 -1.10E+01 -1.00E+01 -1.00E+01
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
122
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Positive Slew Rate 1 @ +15V (V/us)
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.59. Plot of Positive Slew Rate 1 @ +15V (V/us) versus total dose. The data show significant change
with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
123
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.59. Raw data for Positive Slew Rate 1 @ +15V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 1 @ +15V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
9.10E-02
1.03E-01
1.07E-01
1.00E-01
8.90E-02
9.90E-02
9.00E-02
1.12E-01
1.12E-01
9.00E-02
1.04E-01
9.90E-02
20
9.90E-02
7.40E-02
9.60E-02
9.60E-02
8.20E-02
8.20E-02
9.50E-02
1.06E-01
1.06E-01
8.20E-02
9.60E-02
9.10E-02
50
9.30E-02
9.30E-02
9.40E-02
9.20E-02
8.50E-02
7.80E-02
9.40E-02
1.02E-01
8.80E-02
9.10E-02
9.50E-02
9.60E-02
100
7.60E-02
8.10E-02
8.90E-02
7.30E-02
7.90E-02
7.60E-02
7.30E-02
9.00E-02
8.40E-02
6.90E-02
1.03E-01
9.80E-02
200
7.10E-02
6.30E-02
7.10E-02
6.10E-02
6.40E-02
5.30E-02
6.20E-02
6.50E-02
6.90E-02
6.00E-02
9.90E-02
9.90E-02
9.80E-02
7.75E-03
1.19E-01
7.68E-02
8.94E-02
1.09E-02
1.19E-01
5.96E-02
9.14E-02
3.65E-03
1.01E-01
8.14E-02
7.96E-02
6.07E-03
9.62E-02
6.30E-02
6.60E-02
4.69E-03
7.89E-02
5.31E-02
1.01E-01
9.42E-02
9.06E-02
7.84E-02
6.18E-02
1.10E-02
1.20E-02
8.76E-03
8.50E-03
5.97E-03
1.31E-01
1.27E-01
1.15E-01
1.02E-01
7.82E-02
7.03E-02
6.13E-02
6.66E-02
5.51E-02
4.54E-02
6.00E-02
5.00E-02
3.00E-02
1.00E-02
1.00E-02
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
124
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (-KTL) Biased
Positive Slew Rate 2 @ +15V (V/us)
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.60. Plot of Positive Slew Rate 2 @ +15V (V/us) versus total dose. The data show significant change
with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
125
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.60. Raw data for Positive Slew Rate 2 @ +15V (V/us) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Slew Rate 2 @ +15V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
0
1.03E-01
1.03E-01
1.10E-01
1.01E-01
9.70E-02
9.60E-02
1.01E-01
1.12E-01
1.13E-01
9.20E-02
1.01E-01
9.50E-02
20
1.04E-01
9.70E-02
9.90E-02
9.50E-02
8.40E-02
9.30E-02
8.70E-02
1.09E-01
1.07E-01
9.40E-02
9.60E-02
9.90E-02
50
9.70E-02
9.50E-02
9.90E-02
8.60E-02
8.40E-02
8.30E-02
9.30E-02
1.01E-01
1.01E-01
8.30E-02
1.03E-01
9.90E-02
100
8.70E-02
8.40E-02
8.70E-02
7.00E-02
6.60E-02
7.70E-02
7.20E-02
7.70E-02
9.20E-02
7.90E-02
9.40E-02
8.20E-02
200
6.60E-02
7.00E-02
6.70E-02
6.40E-02
5.30E-02
5.20E-02
6.70E-02
6.40E-02
6.40E-02
5.50E-02
8.70E-02
1.01E-01
1.03E-01
4.71E-03
1.16E-01
8.99E-02
9.58E-02
7.40E-03
1.16E-01
7.55E-02
9.22E-02
6.76E-03
1.11E-01
7.37E-02
7.88E-02
1.00E-02
1.06E-01
5.13E-02
6.40E-02
6.52E-03
8.19E-02
4.61E-02
1.03E-01
9.80E-02
9.22E-02
7.94E-02
6.04E-02
9.42E-03
9.54E-03
9.01E-03
7.50E-03
6.50E-03
1.29E-01
1.24E-01
1.17E-01
1.00E-01
7.82E-02
7.70E-02
7.18E-02
6.75E-02
5.88E-02
4.26E-02
6.00E-02
5.00E-02
3.00E-02
1.00E-02
1.00E-02
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
126
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Slew Rate 1 @ +15V (V/us)
0.00E+00
-2.00E-02
-4.00E-02
-6.00E-02
-8.00E-02
-1.00E-01
-1.20E-01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.61. Plot of Negative Slew Rate 1 @ +15V (V/us) versus total dose. The data show significant
change with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
127
200
RLAT Report
09-300 090901 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.61. Raw data for Negative Slew Rate 1 @ +15V (V/us) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 1 @ +15V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.12E-01
-1.08E-01
-1.10E-01
-1.07E-01
-1.02E-01
-1.04E-01
-1.04E-01
-1.17E-01
-1.21E-01
-1.04E-01
-1.01E-01
-1.00E-01
20
-1.05E-01
-1.04E-01
-1.08E-01
-1.04E-01
-9.50E-02
-1.00E-01
-1.01E-01
-1.12E-01
-1.10E-01
-1.05E-01
-1.03E-01
-8.80E-02
50
-9.60E-02
-9.70E-02
-1.00E-01
-9.50E-02
-8.70E-02
-9.10E-02
-8.00E-02
-9.30E-02
-9.20E-02
-8.20E-02
-1.04E-01
-9.80E-02
100
-8.50E-02
-7.90E-02
-9.30E-02
-8.10E-02
-7.50E-02
-7.10E-02
-8.10E-02
-8.90E-02
-8.00E-02
-8.00E-02
-1.03E-01
-1.00E-01
200
-7.20E-02
-5.70E-02
-6.10E-02
-5.00E-02
-5.50E-02
-5.40E-02
-6.50E-02
-6.00E-02
-6.00E-02
-5.40E-02
-9.30E-02
-9.60E-02
-1.08E-01
3.77E-03
-9.75E-02
-1.18E-01
-1.03E-01
4.87E-03
-8.99E-02
-1.17E-01
-9.50E-02
4.85E-03
-8.17E-02
-1.08E-01
-8.26E-02
6.84E-03
-6.38E-02
-1.01E-01
-5.90E-02
8.28E-03
-3.63E-02
-8.17E-02
-1.10E-01 -1.06E-01 -8.76E-02 -8.02E-02 -5.86E-02
8.34E-03
5.32E-03
6.11E-03
6.38E-03
4.67E-03
-8.71E-02 -9.10E-02 -7.09E-02 -6.27E-02 -4.58E-02
-1.33E-01 -1.20E-01 -1.04E-01 -9.77E-02 -7.14E-02
-6.00E-02 -5.00E-02 -3.00E-02 -1.00E-02 -1.00E-02
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
128
RLAT Report
09-300 090901 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Negative Slew Rate 2 @ +15V (V/us)
0.00E+00
-2.00E-02
-4.00E-02
-6.00E-02
-8.00E-02
-1.00E-01
-1.20E-01
0
20
40
60
80
100
120
140
160
180
Total Dose (krad(Si))
Figure 5.62. Plot of Negative Slew Rate 2 @ +15V (V/us) versus total dose. The data show significant
change with radiation, however the parameter remains within specification even after application of the KTLs
statistics. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.62. Raw data for Negative Slew Rate 2 @ +15V (V/us) versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Slew Rate 2 @ +15V (V/us)
Device
408
409
410
411
412
413
414
415
418
419
420
421
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
-1.06E-01
-8.30E-02
-1.10E-01
-1.07E-01
-1.00E-01
-1.03E-01
-1.11E-01
-1.00E-01
-1.17E-01
-1.03E-01
-1.05E-01
-1.03E-01
20
-1.08E-01
-1.05E-01
-1.09E-01
-1.05E-01
-9.80E-02
-1.01E-01
-1.06E-01
-1.07E-01
-1.16E-01
-1.05E-01
-1.03E-01
-9.70E-02
50
-1.02E-01
-9.90E-02
-1.07E-01
-9.70E-02
-9.20E-02
-9.30E-02
-8.80E-02
-1.10E-01
-1.07E-01
-9.50E-02
-1.05E-01
-1.02E-01
100
-9.10E-02
-7.80E-02
-7.60E-02
-7.90E-02
-8.20E-02
-6.90E-02
-8.10E-02
-9.90E-02
-9.20E-02
-7.80E-02
-1.06E-01
-8.40E-02
200
-6.10E-02
-5.80E-02
-6.60E-02
-4.80E-02
-6.00E-02
-4.50E-02
-6.40E-02
-6.60E-02
-6.30E-02
-5.40E-02
-1.05E-01
-1.01E-01
-1.01E-01
1.08E-02
-7.16E-02
-1.31E-01
-1.05E-01
4.30E-03
-9.32E-02
-1.17E-01
-9.94E-02
5.59E-03
-8.41E-02
-1.15E-01
-8.12E-02
5.89E-03
-6.50E-02
-9.74E-02
-5.86E-02
6.62E-03
-4.05E-02
-7.67E-02
-1.07E-01 -1.07E-01 -9.86E-02 -8.38E-02 -5.84E-02
7.01E-03
5.52E-03
9.45E-03
1.18E-02
8.79E-03
-8.76E-02 -9.19E-02 -7.27E-02 -5.14E-02 -3.43E-02
-1.26E-01 -1.22E-01 -1.25E-01 -1.16E-01 -8.25E-02
-6.00E-02 -5.00E-02 -3.00E-02 -1.00E-02 -1.00E-02
PASS
PASS
PASS
PASS
PASS
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6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total
ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The
Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures
the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for
this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately
120rad(Si)/s, determined by the distance from the source.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
were presented in this report. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to
determine the outcome of the testing: following the radiation exposure each parameter had to pass the
specification value and the average value for the five-piece sample must pass the specification value
when the KTL limits are applied. If these conditions were not both satisfied following the radiation
exposure, then the lot would be logged as an RLAT failure.
Based on these criteria, The RH1078MW operational amplifiers passed the RLAT to the maximum
tested level of 200krad(Si) (for the ±15V supply conditions) and 100krad(Si) (for the +5V and 0V
supply conditions) with all measured parameters remaining within specification, including after
application of the KTL statistics. The following exception should be noted, the input offset voltage for
the 5V supply condition was out of specification after application of the KTL statistics intermittently
due to a combination of an aggressive specification value and relative large distribution within the
sample population. The input offset voltage was within specification at the 100krad(Si) read point and
exhibited very little degradation with total ionizing dose.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
Biased Samples:
Pin
1
2
3
4
5
6
7
8
9
10
Function
OUT A
-INPUT A
+INPUT A
N/C
VN/C
+INPUT B
-INPUT B
OUT B
V+
Connection / Bias
To Pin 2 via 10kΩ Resistor
To Pin 1 via 10kΩ Resistor
To 8V via 10kΩ Resistor
N/C
To –15V using 0.1μF Decoupling
N/C
To 8V via 10kΩ Resistor
To Pin 9 via 10kΩ Resistor
To Pin 8 via 10kΩ Resistor
To +15V using 0.1μF Decoupling
Unbiased Samples:
Pin
1
2
3
4
5
6
7
8
9
10
Function
OUT A
-INPUT A
+INPUT A
N/C
VN/C
+INPUT B
-INPUT B
OUT B
V+
Connection / Bias
GND
GND
GND
GND
GND
GND
GND
GND
GND
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was
extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K
“MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY,
PRECISION OP AMP”.
Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR
TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR,
MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
operational amplifiers, voltage comparators, D to A and A to D converters. The LTS2020 Test System
achieves accuracy and sensitivity through the use of software self-calibration and an internal relay
matrix with separate family boards and custom personality adapter boards. The tester uses this relay
matrix to connect the required test circuits, select the appropriate voltage / current sources and establish
the needed measurement loops for all the tests performed. The measured parameters and test conditions
are shown in Table C.1.
Note that test numbers 19 and 20 are modified from the datasheet condition of VCM=100mV to VCM=0V.
This is because the LTS2020 measurement circuit has an impedance of ~333kΩ, such that at 100mV it
is effectively injecting ~300nA of current. This is enough to raise the measured VOL by ~1mV. In our
estimation, modifying the test condition as specified, plus biasing the amp not being measured to have a
VOUT of ~100mV to make sure it’s not saturated, reduces the current injected by the measurement circuit
to ~30nA or less.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain,
where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard
deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes
could be used to qualify these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1078MW.
TEST
NUMBER
TEST
DESCRIPTION
TEST
CONDITIONS
1
Positive Supply Current (ICC2)
V=+5V
2
Negative Supply Current (IEE2)
V=+5V
3&4
Input Offset Voltage (VOS1 &VOS2)
V=+5V
5&6
Input Offset Current (IOS1 & IOS2)
V=+5V
7&8
+ Input Bias Current (IB+1 & IB+2)
V=+5V
9 & 10
- Input Bias Current (IB-1 & IB-2)
V=+5V
11 & 12
13 & 14
15 & 16
17 & 18
Common Mode Rejection Ratio
(CMRR1 & CMRR2)
Power Supply Rejection Ratio
(PSRR1 & PSRR2)
Large Signal Voltage Gain (AVOL 1
&AVOL2)
Large Signal Voltage Gain (AVOL3
&AVOL4)
V=+5V, VCM = 0V to 3.5V
V= 2.3V to 12V
V=+5V, RL =Open
V=+5V, RL =50kΩ
19 & 20
VOUT Low (VOUTLOW1 & VOUTLOW2)
V=+5V, RL =Open, VCM = 0V*
21 & 22
VOUT Low (VOUTLOW3 & VOUTLOW4)
V=+5V, RL =2kΩ
23 & 24
VOUT Low (VOUTLOW5 & VOUTLOW6)
V=+5V, ISINK=100µA
25 & 26
VOUT High (VOUTHIGH1 & VOUTHIGH2)
V=+5V, RL =Open
27 & 28
VOUT High (VOUTHIGH3 & VOUTHIGH4)
V=+5V, RL =2kΩ
29 & 30
+SR (Slew Rate 1 and Slew Rate 2)
V=+5V, AV=1
31 & 32
-SR (Slew Rate 3 and Slew Rate 4)
V=+5V, AV=1
* This is non-datasheet condition, see above for explanation.
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Positive Supply Current (ICC2)
V=±15V
34
Negative Supply Current (IEE2)
V=±15V
35 & 36
Input Offset Voltage (VOS3 &VOS4)
V=±15V
37 & 38
Input Offset Current (IOS3 & IOS4)
V=±15V
39 & 40
+ Input Bias Current (IB+3 & IB+4)
V=±15V
41 & 42
- Input Bias Current (IB-3 & IB-4)
V=±15V
43 & 44
45 & 46
47 & 48
49 & 50
Common Mode Rejection Ratio
(CMRR3 & CMRR4)
Power Supply Rejection Ratio
(PSRR3 & PSRR4)
Large Signal Voltage Gain (AVOL 5
&AVOL6)
Large Signal Voltage Gain (AVOL 7
&AVOL8)
V=±15V, VCM = 13.5V, –15V
V= 5V, 0V to ±18V
V=±15V, RL=50kΩ
V=±15V, RL=2kΩ
51 & 52
VOUT High (VOUTHIGH5 & VOUTHIGH6)
V=±15V, RL=50kΩ
53 & 54
VOUT High (VOUTHIGH7 & VOUTHIGH8)
V=±15V, RL=2kΩ
55 & 56
VOUT Low (VOUTLOW7 & VOUTLOW8)
V=±15V, RL=50kΩ
57 & 58
VOUT Low (VOUTLOW9 & VOUTLOW10)
V=±15V, RL=2kΩ
59 & 60
+SR (Slew Rate 5 and Slew Rate 6)
V=±15V, AV=1
60 & 61
-SR (Slew Rate 7 and Slew Rate 8)
V=±15V, AV=1
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Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution
for the RH1078MW.
Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current (ICC)
1.5E-04A
± 1.31E-06A
Negative Supply Current (IEE)
-1.5E-04A
± 1.07E-06A
Input Offset Voltage (VOS1 &VOS2)
±1.2E-04V
± 3.41E-06V
Input Offset Current (IOS1 & IOS2)
±8E-10A
± 5.06E-11A
+ Input Bias Current (IB+1 & IB+2)
±1.5E-08A
± 5.88E-11A
- Input Bias Current (IB-1 & IB-2)
±1.5E-08A
± 8.03E-11A
94dB
± 3.12E+00 dB
100dB
± 5.70E+00dB
150V/mV
± 2.69E+02V/mV
120V/mV
± 7.13E+02 V/mV
VOUT Low (VOUTLOW1 & VOUTLOW2)
6E-03V
± 1.16E-04V
VOUT Low (VOUTLOW3 & VOUTLOW4)
2E-03V
± 3.43E-05V
VOUT Low (VOUTLOW5 & VOUTLOW6)
1.3E-01V
± 3.22E-04V
VOUT High (VOUTHIGH1 & VOUTHIGH2)
4.2V
± 3.11E-03V
VOUT High (VOUTHIGH3 & VOUTHIGH4)
3.5V
± 2.13E-03V
+SR (Slew Rate 1 and Slew Rate 2)
4E-02V/μs
± 1.07E-03V/μs
-SR (Slew Rate 3 and Slew Rate 4)
-4E-02V/μs
± 1.81E-03 V/μs
Measured Parameter
Common Mode Rejection Ratio
(CMRR1 & CMRR2)
Power Supply Rejection Ratio
(PSRR1 & PSRR2)
Large Signal Voltage Gain (AVOL 1
&AVOL2)
Large Signal Voltage Gain (AVOL3
&AVOL4)
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Pre-Irradiation
Specification
Measurement
Resolution/Precision
Positive Supply Current (ICC2)
2E-04A
± 1.74E-06A
Negative Supply Current (IEE2)
-2E-04A
± 9.73E-07A
Input Offset Voltage (VOS3 &VOS4)
±3.5E-4V
± 2.51E-06V
Input Offset Current (IOS3 & IOS4)
±8E-10A
± 3.54E-11A
+ Input Bias Current (IB+3 & IB+4)
±1.5E-08A
± 3.89E-11A
- Input Bias Current (IB-3 & IB-4)
±1.5E-08A
± 7.51E-11A
97dB
± 2.98E-01dB
100dB
± 4.20E+00dB
1000V/mV
± 2.34E+04V/mV
300V/mV
± 7.07E+01V/mV
VOUT High (VOUTHIGH5 & VOUTHIGH6)
13V
± 2.38E-03V
VOUT High (VOUTHIGH7 & VOUTHIGH8)
11V
± 1.17E-03V
VOUT Low (VOUTLOW7 & VOUTLOW8)
-13V
± 1.75E-03V
VOUT Low (VOUTLOW9 & VOUTLOW10)
-11V
± 4.14E-03V
+SR (Slew Rate 5 and Slew Rate 6)
6E-02V/μs
± 6.97E-03V/μs
-SR (Slew Rate 7 and Slew Rate 8)
-6E-02V/μs
± 9.02E-03V/μs
Measured Parameter
Common Mode Rejection Ratio
(CMRR3 & CMRR4)
Power Supply Rejection Ratio (PSRR3
& PSRR4)
Large Signal Voltage Gain (AVOL 5
&AVOL6)
Large Signal Voltage Gain (AVOL 7
&AVOL8)
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Appendix D: List of Figures Used in Section 5 (RLAT Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
Positive Supply Current @ +5V (A)
Negative Supply Current @ +5V (A)
Input Offset Voltage 1 @ +5V (V)
Input Offset Voltage 2 @ +5V (V)
Input Offset Current 1 @ +5V (A)
Input Offset Current 2 @ +5V (A)
Positive Input Bias Current 1 @ +5V (A)
Positive Input Bias Current 2 @ +5V (A)
Negative Input Bias Current 1 @ +5V (A)
Negative Input Bias Current 2 @+5V (A)
Common Mode Rejection Ratio 1 @ +5V (dB)
Common Mode Rejection Ratio 2 @ +5V (dB)
Power Supply Rejection Ratio 1 @ +5V (dB)
Power Supply Rejection Ratio 2 @ +5V (dB)
Open Loop Gain 1 @ +5V, RL=open (V/mV)
Open Loop Gain 2 @ +5V, RL=open (V/mV)
Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV)
Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV)
Output Voltage Low 1 @ +5V RL=open (V)
Output Voltage Low 2 @ +5V RL=open (V)
Output Voltage Low 1 @ +5V RL=2kΩ (V)
Output Voltage Low 2 @ +5V RL=2kΩ (V)
Output Voltage Low 1 @ +5V IL=100uA (V)
Output Voltage Low 2 @ +5V IL=100uA (V)
Output Voltage High 1 @ +5V RL=open (V)
Output Voltage High 2 @ +5V RL=open (V)
Output Voltage High 1 @ +5V RL=2kΩ (V)
Output Voltage High 2 @ +5V RL=2kΩ (V)
Positive Slew Rate 1 @ +5V (V/us)
Positive Slew Rate 2 @ +5V (V/us)
Negative Slew Rate 1 @ +5V (V/us)
Negative Slew Rate 2 @ +5V (V/us)
Positive Supply Current @ +15V (A)
Negative Supply Current @ +15V (A)
Input Offset Voltage 1 @ +15V (V)
Input Offset Voltage 2 @ +15V (V)
Input Offset Current 1 @ +15V (A)
Input Offset Current 2 @ +15V (A)
Positive Input Bias Current 1 @ +15V (A)
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5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
Positive Input Bias Current 2 @ +15V (A)
Negative Input Bias Current 1 @ +15V (A)
Negative Input Bias Current 2 @ +15V (A)
Common Mode Rejection Ratio 1 @ +15V (dB)
Common Mode Rejection Ratio 2 @ +15V (dB)
Power Supply Rejection Ratio 1 @ +15V (dB)
Power Supply Rejection Ratio 2 @ +15V (dB)
Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV)
Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV)
Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV)
Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV)
Output Voltage High 1 @ +15V RL=open (V)
Output Voltage High 2 @ +15V RL=open (V)
Output Voltage High 1 @ +15V RL=2kΩ (V)
Output Voltage High 2 @ +15V RL=2kΩ (V)
Output Voltage Low 1 @ +15V RL=open (V)
Output Voltage Low 2 @ +15V RL=open (V)
Output Voltage Low 1 @ +15V RL=2kΩ (V)
Output Voltage Low 2 @ +15V RL=2kΩ (V)
Positive Slew Rate 1 @ +15V (V/us)
Positive Slew Rate 2 @ +15V (V/us)
Negative Slew Rate 1 @ +15V (V/us)
Negative Slew Rate 2 @ +15V (V/us)
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