RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1078MW Dual Precision Op Amp for Linear Technology Customer: Linear Technology, PO# 53274L RAD Job Number: 09-300 Part Type Tested: Linear Technology RH1078MW Dual Precision Operational Amplifier Commercial Part Number: RH1078MW Traceability Information: Lot Date Code: 0808B, Fab # WP1630.2 Wafer 8, Assy Lot A21527.1. Information obtained from Linear Technology PO#53274L. See Appendix A for a photograph of the unit-under-test Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation (all pins tied to ground) and 2 control units. Serial numbers 408-412 were biased during irradiation, serial numbers 413-415, 418 and 419 were unbiased during irradiation and serial numbers 420 and 421 were used as the controls. See Appendix B for the radiation bias connection table. External Traveler: None required Pre-Irradiation Burn-In: Burn-In performed by Linear Devices prior to receipt by RAD. TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 20, 50, 100, and 200krad(Si). TID Overtest and Post-Irradiation Anneal: No overtest or anneal. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Hardware and Software: LTS2020 Tester (TS03), 2101 Family Board (FB02), 0600 Fixture (TF01) and RH1078 DUT Board (BGSS-080820) and RH1078LT.SRC test program. Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C±6°C per MILSTD-883. RLAT Result: PASSED. Units passed to 200krad(Si) for the ±15V supply condition and to 100krad(Si) for the single sided 5V supply condition with all parameters remaining within specification, including after application of 90/90 KTL statistics. An ISO 9001:2000 Certified Company 1 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2000 Certified Company 2 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2000 Certified Company 3 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1078MW dual precision op amps described in this final report were irradiated using a split 15V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix B for the full bias circuits. These bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 20, 50, 100 and 200krad(Si) for all electrical tests using the ±15V supply and with incremental readings at 20, 50 and 100krad(Si) for all electrical tests using the +5V and 0V supply conditions (See LINEAR TECHNOLOGY CORPORATION RH1078M Dual Precision Operational Amplifier Datasheet). Note that although we tested this device to 100krad(Si) using the +5V supply condition and the units-under-test passed to 100krad(Si) it is only guaranteed by the manufacturer to 75krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum enclosure was determined based on TLD dosimetry measurements (see previous section). The final dose rate for this work was 62.6rad(Si)/s with a precision of ±5%. An ISO 9001:2000 Certified Company 4 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the radiation lot acceptance testing the pre- and post-irradiation electrical parameters measured were: ±15V Tests Positive Supply Current (ICC2) Negative Supply Current (IEE2) Input Offset Voltage (VOS3 &VOS4) Input Offset Current (IOS3 & IOS4) + Input Bias Current (IB+3 & IB+4) - Input Bias Current (IB-3 & IB-4) Common Mode Rejection Ratio (CMRR3 & CMRR4) Power Supply Rejection Ratio (PSRR3 & PSRR4) Large Signal Voltage Gain (AVOL 5 &AVOL6) Large Signal Voltage Gain (AVOL 7 &AVOL8) VOUT High (VOUTHIGH5 & VOUTHIGH6) VOUT High (VOUTHIGH7 & VOUTHIGH8) VOUT Low (VOUTLOW7 & VOUTLOW8) VOUT Low (VOUTLOW9 & VOUTLOW10) +SR (Slew Rate 5 and Slew Rate 6) -SR (Slew Rate 7 and Slew Rate 8) +5V Tests Positive Supply Current (ICC2) Negative Supply Current (IEE2) Input Offset Voltage (VOS1 &VOS2) Input Offset Current (IOS1 & IOS2) + Input Bias Current (IB+1 & IB+2) - Input Bias Current (IB-1 & IB-2) Common Mode Rejection Ratio (CMRR1 & CMRR2) Power Supply Rejection Ratio (PSRR1 & PSRR2) Large Signal Voltage Gain (AVOL 1 &AVOL2) Large Signal Voltage Gain (AVOL3 &AVOL4) VOUT Low (VOUTLOW1 & VOUTLOW2) VOUT Low (VOUTLOW3 & VOUTLOW4) VOUT Low (VOUTLOW5 & VOUTLOW6) VOUT High (VOUTHIGH1 & VOUTHIGH2) VOUT High (VOUTHIGH3 & VOUTHIGH4) +SR (Slew Rate 1 and Slew Rate 2) -SR (Slew Rate 3 and Slew Rate 4) An ISO 9001:2000 Certified Company 5 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 The parametric data was obtained as read and record and all the raw data plus an attributes summary are contained in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. Note that the following criteria must be met for a device to pass the RLAT: following the radiation exposure each of the 5 pieces shall pass the specification value and the average value for the ten-piece sample must pass the specification value when the KTL limits are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot could be logged as a failure. 5.0. Total Ionizing Dose Test Results The RH1078MW operational amplifiers passed the RLAT to the maximum tested level of 200krad(Si) (for the ±15V supply conditions) and 100krad(Si) (for the +5V and 0V supply conditions) with all measured parameters remaining within specification, including after application of the KTL statistics. The following exception should be noted, the input offset voltage for the 5V supply condition was out of specification intermittently after application of the KTL statistics due to a combination of an aggressive specification value and relative large distribution of the sample population. The input offset voltage was within specification at the 100krad(Si) read point. Figures 5.1 and 5.62 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.62 show the corresponding raw data for each of these parameters. Appendix D lists all the figures in this section to aid in locating a particular parameter. As seen in the data tables the control units, as expected, show no significant changes throughout the test indicating that our electrical testing remained stable throughout the testing. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 6 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Supply Current @ +5V (A) 1.60E-04 1.40E-04 1.20E-04 1.00E-04 8.00E-05 6.00E-05 4.00E-05 2.00E-05 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.1. Plot of Positive Supply Current @ +5V (A) versus total dose. The data show no significant change (or slight improvement) with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 7 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.1. Raw data for Positive Supply Current @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 9.40E-05 9.10E-05 9.90E-05 9.70E-05 9.00E-05 9.00E-05 9.10E-05 9.90E-05 9.90E-05 9.20E-05 9.30E-05 8.90E-05 20 8.80E-05 8.70E-05 9.30E-05 8.90E-05 8.30E-05 8.20E-05 8.60E-05 9.30E-05 9.40E-05 8.40E-05 9.60E-05 8.60E-05 50 7.80E-05 7.70E-05 8.20E-05 7.80E-05 7.70E-05 7.10E-05 7.70E-05 8.20E-05 8.30E-05 7.50E-05 9.50E-05 8.80E-05 100 6.50E-05 6.30E-05 6.40E-05 6.30E-05 5.80E-05 5.40E-05 6.10E-05 6.40E-05 6.10E-05 6.30E-05 9.40E-05 8.60E-05 9.42E-05 3.83E-06 1.05E-04 8.37E-05 8.80E-05 3.61E-06 9.79E-05 7.81E-05 7.84E-05 2.07E-06 8.41E-05 7.27E-05 6.26E-05 2.70E-06 7.00E-05 5.52E-05 9.42E-05 8.78E-05 7.76E-05 6.06E-05 4.44E-06 5.40E-06 4.98E-06 3.91E-06 1.06E-04 1.03E-04 9.13E-05 7.13E-05 8.20E-05 7.30E-05 6.39E-05 4.99E-05 1.50E-04 1.50E-04 1.50E-04 1.50E-04 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 8 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Negative Supply Current @ +5V (A) 0.00E+00 -2.00E-05 -4.00E-05 -6.00E-05 -8.00E-05 -1.00E-04 -1.20E-04 -1.40E-04 -1.60E-04 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 9 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.2. Raw data for Negative Supply Current @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -9.00E-05 -9.00E-05 -9.60E-05 -9.30E-05 -8.60E-05 -8.70E-05 -9.00E-05 -9.70E-05 -9.80E-05 -9.10E-05 -9.00E-05 -8.50E-05 20 -8.30E-05 -8.30E-05 -9.00E-05 -8.60E-05 -8.00E-05 -8.10E-05 -8.40E-05 -9.10E-05 -9.00E-05 -8.40E-05 -9.00E-05 -8.50E-05 50 -7.50E-05 -7.40E-05 -8.00E-05 -7.60E-05 -7.30E-05 -8.70E-05 -7.50E-05 -8.00E-05 -7.90E-05 -7.30E-05 -9.10E-05 -8.50E-05 100 -4.60E-05 -7.00E-05 -6.60E-05 -6.10E-05 -5.80E-05 -3.60E-05 -6.20E-05 -3.30E-05 -4.50E-05 -4.20E-05 -9.10E-05 -8.50E-05 -9.10E-05 3.74E-06 -8.07E-05 -1.01E-04 -8.44E-05 3.78E-06 -7.40E-05 -9.48E-05 -7.56E-05 2.70E-06 -6.82E-05 -8.30E-05 -6.02E-05 9.18E-06 -3.50E-05 -8.54E-05 -9.26E-05 -8.60E-05 -7.88E-05 -4.36E-05 4.72E-06 4.30E-06 5.40E-06 1.13E-05 -7.97E-05 -7.42E-05 -6.40E-05 -1.25E-05 -1.06E-04 -9.78E-05 -9.36E-05 -7.47E-05 -1.50E-04 -1.50E-04 -1.50E-04 -1.50E-04 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 10 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 1 @ +5V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.3. Plot of Input Offset Voltage 1 @ +5V (V) versus total dose. The data show no significant change with radiation, however the KTL values are out of specification early in the test due to a combination of an aggressive specification and relatively large distribution within the sample population. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 11 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.3. Raw data for Input Offset Voltage 1 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 @ +5V (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.82E-05 4.09E-05 4.22E-05 4.60E-06 4.45E-05 5.24E-05 4.77E-05 -4.19E-05 -8.80E-06 3.76E-06 1.34E-05 -1.89E-05 20 -5.77E-05 2.87E-05 1.41E-05 -8.57E-06 3.08E-05 4.87E-05 4.72E-05 -5.38E-05 -1.01E-05 8.23E-06 1.34E-05 -1.80E-05 50 -5.87E-05 5.22E-05 7.38E-06 3.75E-06 4.46E-05 5.19E-05 5.21E-05 -9.88E-05 -3.59E-05 9.41E-06 1.17E-05 -1.98E-05 100 -2.56E-05 9.47E-05 4.00E-05 6.35E-05 7.44E-05 1.09E-04 9.32E-05 -9.72E-05 -1.16E-05 4.43E-05 1.62E-05 -1.68E-05 1.88E-05 3.58E-05 1.17E-04 -7.95E-05 1.47E-06 3.66E-05 1.02E-04 -9.90E-05 9.84E-06 4.40E-05 1.30E-04 -1.11E-04 4.94E-05 4.63E-05 1.76E-04 -7.76E-05 1.06E-05 8.05E-06 -4.25E-06 2.76E-05 3.97E-05 4.28E-05 6.41E-05 8.42E-05 1.19E-04 1.25E-04 1.72E-04 2.58E-04 -9.81E-05 -1.09E-04 -1.80E-04 -2.03E-04 -1.20E-04 -1.20E-04 -2.50E-04 -5.00E-04 PASS PASS PASS PASS 1.20E-04 1.20E-04 2.50E-04 5.00E-04 PASS FAIL PASS PASS An ISO 9001:2000 Certified Company 12 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 2 @ +5V (V) 6.00E-04 4.00E-04 2.00E-04 0.00E+00 -2.00E-04 -4.00E-04 -6.00E-04 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.4. Plot of Input Offset Voltage 2 @ +5V (V) versus total dose. The data show no significant change with radiation, however the KTL values are out of specification early in the test due to a combination of an aggressive specification and relatively large distribution within the sample population. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 13 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.4. Raw data for Input Offset Voltage 2 @ +5V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 2 @ +5V (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.17E-05 -3.21E-05 -6.17E-05 1.05E-05 3.25E-05 -3.88E-05 -4.60E-05 -4.54E-05 -1.00E-05 3.86E-05 -2.98E-05 -5.36E-05 20 -5.93E-05 -6.16E-05 -8.92E-05 -8.82E-06 1.21E-05 -6.57E-05 -7.08E-05 -8.77E-05 -2.85E-05 1.70E-05 -3.13E-05 -5.36E-05 50 -5.89E-05 -5.71E-05 -9.65E-05 9.19E-06 2.56E-05 -5.48E-05 -6.17E-05 -9.68E-05 -1.29E-05 2.01E-05 -2.72E-05 -5.46E-05 100 -3.79E-05 -1.62E-05 -6.04E-05 6.12E-05 6.04E-05 -4.34E-06 -6.63E-06 -8.02E-05 6.42E-05 5.62E-05 -2.76E-05 -5.45E-05 -1.65E-05 3.76E-05 8.65E-05 -1.19E-04 -4.14E-05 4.16E-05 7.28E-05 -1.56E-04 -3.55E-05 5.12E-05 1.05E-04 -1.76E-04 1.43E-06 5.64E-05 1.56E-04 -1.53E-04 -2.03E-05 -4.71E-05 -4.12E-05 5.85E-06 3.61E-05 4.19E-05 4.54E-05 5.83E-05 7.86E-05 6.77E-05 8.33E-05 1.66E-04 -1.19E-04 -1.62E-04 -1.66E-04 -1.54E-04 -1.20E-04 -1.20E-04 -2.50E-04 -5.00E-04 PASS FAIL PASS PASS 1.20E-04 1.20E-04 2.50E-04 5.00E-04 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 14 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 1 @ +5V (A) 2.00E-08 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.5. Plot of Input Offset Current 1 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 15 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.5. Raw data for Input Offset Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 1 @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -9.00E-11 4.00E-11 -2.50E-10 -1.50E-10 -1.50E-10 -1.40E-10 3.00E-11 -2.10E-10 -1.00E-11 -5.00E-11 9.00E-11 -3.00E-11 20 -3.30E-10 -3.00E-11 -9.00E-11 -2.50E-10 -2.80E-10 -1.00E-10 -1.00E-10 -1.80E-10 -7.00E-11 -1.00E-11 4.00E-11 -6.00E-11 50 -4.50E-10 7.00E-11 -3.20E-10 -1.50E-10 -8.00E-11 -1.50E-10 -2.10E-10 -3.10E-10 -9.00E-11 -2.00E-11 -5.00E-11 3.00E-11 100 -5.60E-10 2.00E-11 -1.50E-10 -1.00E-10 -4.10E-10 -1.30E-10 -3.20E-10 -3.30E-10 -1.20E-10 1.00E-10 0.00E+00 -1.30E-10 -1.20E-10 1.06E-10 1.71E-10 -4.11E-10 -1.96E-10 1.29E-10 1.58E-10 -5.50E-10 -1.86E-10 2.04E-10 3.72E-10 -7.44E-10 -2.40E-10 2.38E-10 4.13E-10 -8.93E-10 -7.60E-11 -9.20E-11 -1.56E-10 -1.60E-10 9.79E-11 6.14E-11 1.11E-10 1.76E-10 1.92E-10 7.64E-11 1.49E-10 3.24E-10 -3.44E-10 -2.60E-10 -4.61E-10 -6.44E-10 -8.00E-10 -2.00E-09 -1.30E-08 -1.80E-08 PASS PASS PASS PASS 8.00E-10 2.00E-09 1.30E-08 1.80E-08 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 16 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 2 @ +5V (A) 2.00E-08 1.50E-08 1.00E-08 5.00E-09 0.00E+00 -5.00E-09 -1.00E-08 -1.50E-08 -2.00E-08 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.6. Plot of Input Offset Current 2 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 17 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.6. Raw data for Input Offset Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 8.00E-11 -9.00E-11 -1.60E-10 -1.80E-10 -1.20E-10 0.00E+00 -4.00E-11 -3.00E-11 -5.00E-11 -1.60E-10 -2.50E-10 -3.00E-11 20 3.00E-11 -9.00E-11 0.00E+00 4.00E-11 -1.30E-10 -6.00E-11 -9.00E-11 -2.00E-10 -5.10E-10 -1.30E-10 -2.30E-10 3.00E-11 50 3.00E-11 -2.20E-10 -1.50E-10 -1.50E-10 -2.70E-10 -1.60E-10 -9.00E-11 2.00E-11 -1.29E-09 -3.20E-10 -7.00E-11 0.00E+00 100 1.20E-10 -4.20E-10 -3.60E-10 -2.30E-10 -6.00E-11 -1.30E-10 -1.90E-10 -8.00E-11 -4.15E-09 -1.50E-10 -1.50E-10 3.00E-11 -9.40E-11 1.03E-10 1.89E-10 -3.77E-10 -3.00E-11 7.58E-11 1.78E-10 -2.38E-10 -1.52E-10 1.14E-10 1.60E-10 -4.64E-10 -1.90E-10 2.22E-10 4.18E-10 -7.98E-10 -5.60E-11 -1.98E-10 -3.68E-10 -9.40E-10 6.11E-11 1.82E-10 5.30E-10 1.79E-09 1.11E-10 3.01E-10 1.09E-09 3.98E-09 -2.23E-10 -6.97E-10 -1.82E-09 -5.86E-09 -8.00E-10 -2.00E-09 -1.30E-08 -1.80E-08 PASS PASS PASS PASS 8.00E-10 2.00E-09 1.30E-08 1.80E-08 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 18 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 1 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.7. Plot of Positive Input Bias Current 1 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 19 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.7. Raw data for Positive Input Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 1 @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 7.75E-09 8.28E-09 8.62E-09 8.23E-09 8.45E-09 8.06E-09 8.68E-09 7.73E-09 8.01E-09 8.88E-09 8.27E-09 8.67E-09 20 1.17E-08 1.16E-08 1.24E-08 1.18E-08 1.24E-08 1.19E-08 1.26E-08 1.18E-08 1.24E-08 1.35E-08 8.18E-09 8.83E-09 50 1.81E-08 1.79E-08 1.87E-08 1.84E-08 1.86E-08 1.84E-08 1.95E-08 1.86E-08 1.97E-08 2.06E-08 8.24E-09 8.78E-09 100 2.90E-08 2.80E-08 2.95E-08 2.81E-08 2.84E-08 2.79E-08 3.00E-08 2.99E-08 3.03E-08 3.13E-08 8.20E-09 8.76E-09 8.27E-09 3.27E-10 9.16E-09 7.37E-09 1.20E-08 3.84E-10 1.30E-08 1.09E-08 1.83E-08 3.26E-10 1.92E-08 1.74E-08 2.86E-08 6.41E-10 3.04E-08 2.68E-08 8.27E-09 1.24E-08 1.93E-08 2.99E-08 4.86E-10 6.98E-10 8.96E-10 1.25E-09 9.60E-09 1.44E-08 2.18E-08 3.33E-08 6.94E-09 1.05E-08 1.69E-08 2.65E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07 PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.00E-07 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 20 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Positive Input Bias Current 2 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.8. Plot of Positive Input Bias Current 2 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 21 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.8. Raw data for Positive Input Bias Current 2 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 2 @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 8.13E-09 8.13E-09 8.59E-09 8.06E-09 8.48E-09 8.21E-09 8.86E-09 7.65E-09 7.89E-09 9.00E-09 8.18E-09 8.85E-09 20 1.22E-08 1.14E-08 1.25E-08 1.20E-08 1.25E-08 1.21E-08 1.28E-08 1.17E-08 1.25E-08 1.35E-08 8.29E-09 8.87E-09 50 1.90E-08 1.76E-08 1.87E-08 1.86E-08 1.87E-08 1.84E-08 1.97E-08 1.88E-08 2.00E-08 2.06E-08 8.18E-09 8.89E-09 100 3.00E-08 2.75E-08 2.96E-08 2.84E-08 2.84E-08 2.80E-08 3.06E-08 3.01E-08 3.13E-08 3.15E-08 8.25E-09 8.83E-09 8.28E-09 2.40E-10 8.93E-09 7.62E-09 1.21E-08 4.27E-10 1.33E-08 1.09E-08 1.85E-08 5.46E-10 2.00E-08 1.70E-08 2.88E-08 9.92E-10 3.15E-08 2.61E-08 8.32E-09 1.25E-08 1.95E-08 3.03E-08 5.92E-10 6.77E-10 9.01E-10 1.40E-09 9.94E-09 1.44E-08 2.20E-08 3.41E-08 6.70E-09 1.07E-08 1.70E-08 2.64E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07 PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.00E-07 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 22 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Negative Input Bias Current 1 @ +5V (A) 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.9. Plot of Negative Input Bias Current 1 @ +5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 23 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.9. Raw data for Negative Input Bias Current 1 @ +5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 1 @ +5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 8.02E-09 8.15E-09 8.64E-09 8.37E-09 8.52E-09 8.26E-09 8.74E-09 7.87E-09 8.10E-09 9.04E-09 8.25E-09 8.79E-09 20 1.19E-08 1.18E-08 1.23E-08 1.20E-08 1.26E-08 1.21E-08 1.28E-08 1.20E-08 1.26E-08 1.36E-08 8.24E-09 8.82E-09 50 1.85E-08 1.79E-08 1.91E-08 1.86E-08 1.90E-08 1.85E-08 1.96E-08 1.90E-08 1.99E-08 2.05E-08 8.27E-09 8.83E-09 100 2.96E-08 2.80E-08 2.99E-08 2.84E-08 2.88E-08 2.83E-08 3.07E-08 3.02E-08 3.07E-08 3.15E-08 8.19E-09 8.86E-09 8.34E-09 2.56E-10 9.04E-09 7.64E-09 1.21E-08 3.44E-10 1.30E-08 1.12E-08 1.86E-08 4.74E-10 1.99E-08 1.73E-08 2.89E-08 8.11E-10 3.12E-08 2.67E-08 8.40E-09 1.26E-08 1.95E-08 3.03E-08 4.78E-10 6.28E-10 7.84E-10 1.18E-09 9.71E-09 1.43E-08 2.16E-08 3.35E-08 7.09E-09 1.09E-08 1.73E-08 2.70E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07 PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.00E-07 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 24 Negative Input Bias Current 2 @+5V (A) RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.10. Plot of Negative Input Bias Current 2 @+5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 25 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.10. Raw data for Negative Input Bias Current 2 @+5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 2 @+5V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 8.18E-09 8.29E-09 8.69E-09 8.21E-09 8.62E-09 8.16E-09 8.96E-09 7.89E-09 8.07E-09 9.21E-09 8.31E-09 9.01E-09 20 1.21E-08 1.18E-08 1.25E-08 1.21E-08 1.25E-08 1.21E-08 1.31E-08 1.21E-08 1.29E-08 1.37E-08 8.43E-09 8.95E-09 50 1.89E-08 1.80E-08 1.92E-08 1.87E-08 1.91E-08 1.86E-08 1.98E-08 1.88E-08 2.13E-08 2.08E-08 8.37E-09 8.86E-09 100 3.02E-08 2.80E-08 2.99E-08 2.86E-08 2.87E-08 2.81E-08 3.06E-08 3.01E-08 3.55E-08 3.16E-08 8.33E-09 8.95E-09 8.40E-09 2.39E-10 9.05E-09 7.74E-09 1.22E-08 3.17E-10 1.30E-08 1.13E-08 1.88E-08 4.79E-10 2.01E-08 1.75E-08 2.91E-08 9.42E-10 3.17E-08 2.65E-08 8.46E-09 1.28E-08 1.98E-08 3.12E-08 5.87E-10 6.94E-10 1.18E-09 2.73E-09 1.01E-08 1.47E-08 2.31E-08 3.87E-08 6.85E-09 1.09E-08 1.66E-08 2.37E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.00E-07 PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.00E-07 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 26 Common Mode Rejection Ratio 1 @ +5V (dB) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.10E+02 1.05E+02 1.00E+02 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.11. Plot of Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 27 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.11. Raw data for Common Mode Rejection Ratio 1 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 @ +5V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.11E+02 1.00E+02 1.07E+02 1.04E+02 1.03E+02 1.11E+02 1.03E+02 1.06E+02 1.06E+02 1.00E+02 1.01E+02 1.09E+02 20 1.08E+02 9.84E+01 9.95E+01 1.02E+02 1.02E+02 9.82E+01 1.04E+02 1.04E+02 1.06E+02 1.01E+02 1.05E+02 1.01E+02 50 1.06E+02 9.74E+01 9.75E+01 9.71E+01 9.98E+01 9.99E+01 1.01E+02 1.02E+02 1.01E+02 1.00E+02 1.03E+02 1.05E+02 100 1.05E+02 9.74E+01 9.69E+01 9.85E+01 9.92E+01 9.65E+01 9.74E+01 9.91E+01 9.98E+01 9.92E+01 1.02E+02 1.05E+02 1.05E+02 3.91E+00 1.16E+02 9.43E+01 1.02E+02 3.77E+00 1.12E+02 9.18E+01 9.96E+01 3.84E+00 1.10E+02 8.91E+01 9.95E+01 3.45E+00 1.09E+02 9.00E+01 1.05E+02 1.03E+02 1.01E+02 9.84E+01 3.91E+00 2.96E+00 8.61E-01 1.39E+00 1.16E+02 1.11E+02 1.03E+02 1.02E+02 9.46E+01 9.45E+01 9.85E+01 9.46E+01 9.40E+01 9.10E+01 8.70E+01 8.50E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 28 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio 2 @ +5V (dB) 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.12. Plot of Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 29 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.12. Raw data for Common Mode Rejection Ratio 2 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 @ +5V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.26E+02 1.10E+02 1.10E+02 1.13E+02 1.25E+02 1.06E+02 1.06E+02 1.16E+02 1.10E+02 1.04E+02 1.09E+02 1.10E+02 20 1.09E+02 1.02E+02 1.08E+02 1.05E+02 1.05E+02 1.03E+02 1.03E+02 1.05E+02 1.10E+02 1.01E+02 1.06E+02 1.07E+02 50 1.07E+02 1.02E+02 1.01E+02 1.01E+02 1.06E+02 1.00E+02 1.00E+02 1.09E+02 1.11E+02 9.87E+01 1.05E+02 1.06E+02 100 1.02E+02 9.86E+01 1.00E+02 1.00E+02 1.03E+02 9.81E+01 9.85E+01 1.02E+02 1.06E+02 9.92E+01 1.09E+02 1.10E+02 1.17E+02 8.06E+00 1.39E+02 9.46E+01 1.06E+02 2.64E+00 1.13E+02 9.86E+01 1.03E+02 2.73E+00 1.11E+02 9.59E+01 1.01E+02 1.65E+00 1.05E+02 9.63E+01 1.08E+02 1.04E+02 1.04E+02 1.01E+02 4.95E+00 3.66E+00 5.61E+00 3.19E+00 1.22E+02 1.14E+02 1.19E+02 1.09E+02 9.49E+01 9.44E+01 8.83E+01 9.19E+01 9.40E+01 9.10E+01 8.70E+01 8.50E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 30 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 1 @ +5V (dB) 1.40E+02 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.13. Plot of Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 31 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.13. Raw data for Power Supply Rejection Ratio 1 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 1 @ +5V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.23E+02 1.20E+02 1.40E+02 1.49E+02 1.32E+02 1.27E+02 1.26E+02 1.41E+02 1.23E+02 1.20E+02 1.17E+02 1.29E+02 20 1.16E+02 1.19E+02 1.33E+02 1.21E+02 1.30E+02 1.23E+02 1.19E+02 1.44E+02 1.38E+02 1.26E+02 1.15E+02 1.22E+02 50 1.15E+02 1.36E+02 1.27E+02 1.19E+02 1.21E+02 1.20E+02 1.30E+02 1.38E+02 1.19E+02 1.19E+02 1.16E+02 1.21E+02 100 1.12E+02 1.21E+02 1.17E+02 1.10E+02 1.17E+02 1.14E+02 1.15E+02 1.21E+02 1.12E+02 1.14E+02 1.28E+02 1.19E+02 1.33E+02 1.20E+01 1.66E+02 1.00E+02 1.24E+02 7.11E+00 1.43E+02 1.04E+02 1.24E+02 8.37E+00 1.47E+02 1.01E+02 1.16E+02 4.25E+00 1.27E+02 1.04E+02 1.27E+02 1.30E+02 1.25E+02 1.15E+02 8.18E+00 1.04E+01 8.50E+00 3.27E+00 1.50E+02 1.58E+02 1.48E+02 1.24E+02 1.05E+02 1.02E+02 1.02E+02 1.06E+02 1.00E+02 1.00E+02 9.80E+01 8.80E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 32 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Power Supply Rejection Ratio 2 @ +5V (dB) 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.14. Plot of Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose. The data show some degradation with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 33 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.14. Raw data for Power Supply Rejection Ratio 2 @ +5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 2 @ +5V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.16E+02 1.27E+02 1.26E+02 1.36E+02 1.19E+02 1.28E+02 1.19E+02 1.16E+02 1.25E+02 1.38E+02 1.19E+02 1.12E+02 20 1.15E+02 1.22E+02 1.19E+02 1.19E+02 1.31E+02 1.11E+02 1.17E+02 1.18E+02 1.22E+02 1.20E+02 1.16E+02 1.13E+02 50 1.12E+02 1.18E+02 1.12E+02 1.13E+02 1.13E+02 1.20E+02 1.12E+02 1.14E+02 1.21E+02 1.13E+02 1.20E+02 1.13E+02 100 1.08E+02 1.18E+02 1.13E+02 1.11E+02 1.13E+02 1.08E+02 1.11E+02 1.08E+02 1.19E+02 1.11E+02 1.21E+02 1.09E+02 1.25E+02 8.12E+00 1.47E+02 1.03E+02 1.21E+02 6.10E+00 1.38E+02 1.04E+02 1.14E+02 2.65E+00 1.21E+02 1.06E+02 1.12E+02 3.76E+00 1.23E+02 1.02E+02 1.25E+02 1.18E+02 1.16E+02 1.11E+02 8.52E+00 4.13E+00 4.30E+00 4.49E+00 1.49E+02 1.29E+02 1.28E+02 1.24E+02 1.02E+02 1.06E+02 1.04E+02 9.90E+01 1.00E+02 1.00E+02 9.80E+01 8.80E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 34 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=open (V/mV) 2.00E+03 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.15. Plot of Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 35 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.15. Raw data for Open Loop Gain 1 @ +5V, RL=open (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=open (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.36E+03 1.08E+03 1.23E+03 1.48E+03 1.42E+03 1.29E+03 1.59E+03 1.29E+03 1.35E+03 1.31E+03 1.32E+03 1.53E+03 20 1.44E+03 1.12E+03 1.06E+03 1.10E+03 1.57E+03 1.01E+03 1.40E+03 1.04E+03 1.30E+03 1.04E+03 1.28E+03 1.30E+03 50 1.35E+03 1.67E+03 1.78E+03 1.99E+03 2.36E+03 1.30E+03 1.23E+03 1.26E+03 1.32E+03 1.25E+03 1.34E+03 1.22E+03 100 9.99E+02 1.12E+03 1.71E+03 1.42E+03 9.99E+02 9.99E+02 1.88E+03 1.51E+03 9.99E+02 1.03E+03 1.33E+03 1.46E+03 1.31E+03 1.62E+02 1.76E+03 8.70E+02 1.26E+03 2.33E+02 1.90E+03 6.19E+02 1.83E+03 3.76E+02 2.86E+03 7.98E+02 1.25E+03 3.10E+02 2.10E+03 4.00E+02 1.36E+03 1.16E+03 1.27E+03 1.28E+03 1.27E+02 1.79E+02 3.66E+01 3.97E+02 1.71E+03 1.65E+03 1.37E+03 2.37E+03 1.02E+03 6.68E+02 1.17E+03 1.95E+02 1.50E+02 1.50E+02 1.00E+02 5.00E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 36 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=open (V/mV) 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.16. Plot of Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 37 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.16. Raw data for Open Loop Gain 2 @ +5V, RL=open (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=open (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.28E+03 1.09E+03 1.14E+03 1.21E+03 1.09E+03 1.34E+03 1.62E+03 1.14E+03 1.23E+03 1.23E+03 1.18E+03 1.44E+03 20 1.35E+03 1.38E+03 1.21E+03 1.43E+03 1.15E+03 1.40E+03 1.10E+03 1.13E+03 1.68E+03 1.35E+03 1.54E+03 1.27E+03 50 1.28E+03 1.28E+03 1.23E+03 1.19E+03 1.82E+03 1.68E+03 1.62E+03 1.85E+03 1.15E+03 1.35E+03 1.52E+03 1.34E+03 100 1.58E+03 9.99E+02 1.28E+03 9.99E+02 9.99E+02 1.78E+03 9.99E+02 2.04E+03 9.99E+02 1.90E+03 1.81E+03 1.21E+03 1.16E+03 8.35E+01 1.39E+03 9.32E+02 1.30E+03 1.21E+02 1.64E+03 9.71E+02 1.36E+03 2.59E+02 2.07E+03 6.51E+02 1.17E+03 2.58E+02 1.88E+03 4.64E+02 1.31E+03 1.33E+03 1.53E+03 1.54E+03 1.85E+02 2.34E+02 2.77E+02 5.06E+02 1.82E+03 1.98E+03 2.29E+03 2.93E+03 8.08E+02 6.90E+02 7.70E+02 1.57E+02 1.50E+02 1.50E+02 1.00E+02 5.00E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 38 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) 2.00E+03 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.17. Plot of Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show significant degradation with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 39 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.17. Raw data for Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.41E+03 2.31E+03 2.01E+03 1.88E+03 1.39E+03 1.46E+03 2.41E+03 1.82E+03 2.07E+03 1.71E+03 1.16E+03 1.23E+03 20 1.09E+03 1.28E+03 1.67E+03 9.69E+02 8.91E+02 1.28E+03 1.27E+03 1.71E+03 7.67E+02 1.31E+03 1.30E+03 1.75E+03 50 5.28E+02 5.10E+02 6.67E+02 4.45E+02 5.82E+02 4.83E+02 6.39E+02 7.65E+02 6.20E+02 6.35E+02 1.59E+03 1.32E+03 100 2.38E+02 2.54E+02 2.72E+02 2.23E+02 2.55E+02 2.13E+02 2.47E+02 2.42E+02 2.39E+02 2.00E+02 1.67E+03 1.35E+03 1.80E+03 3.96E+02 2.89E+03 7.12E+02 1.18E+03 3.10E+02 2.03E+03 3.31E+02 5.46E+02 8.32E+01 7.75E+02 3.18E+02 2.48E+02 1.87E+01 3.00E+02 1.97E+02 1.89E+03 1.27E+03 6.28E+02 2.28E+02 3.65E+02 3.34E+02 1.00E+02 2.04E+01 2.89E+03 2.18E+03 9.03E+02 2.84E+02 8.91E+02 3.50E+02 3.54E+02 1.72E+02 1.20E+02 1.20E+02 2.00E+01 1.00E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 40 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.18. Plot of Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose. The data show significant degradation with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 41 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.18. Raw data for Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.13E+03 1.66E+03 1.67E+03 1.98E+03 1.64E+03 1.87E+03 1.37E+03 1.35E+03 1.73E+03 1.40E+03 1.37E+03 1.04E+03 20 9.74E+02 1.38E+03 1.29E+03 1.04E+03 1.05E+03 1.07E+03 9.37E+02 1.09E+03 1.63E+03 1.29E+03 1.27E+03 1.19E+03 50 5.73E+02 6.34E+02 5.50E+02 6.06E+02 4.74E+02 4.35E+02 5.90E+02 4.91E+02 5.12E+02 4.90E+02 1.32E+03 1.22E+03 100 2.46E+02 2.46E+02 2.52E+02 2.43E+02 2.39E+02 1.79E+02 2.12E+02 2.10E+02 2.21E+02 2.17E+02 1.69E+03 1.19E+03 1.61E+03 3.09E+02 2.46E+03 7.68E+02 1.15E+03 1.77E+02 1.63E+03 6.64E+02 5.67E+02 6.10E+01 7.35E+02 4.00E+02 2.45E+02 4.51E+00 2.57E+02 2.33E+02 1.54E+03 1.20E+03 5.03E+02 2.08E+02 2.42E+02 2.72E+02 5.59E+01 1.67E+01 2.21E+03 1.95E+03 6.57E+02 2.54E+02 8.80E+02 4.58E+02 3.50E+02 1.62E+02 1.20E+02 1.20E+02 2.00E+01 1.00E+01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 42 Output Voltage Low 1 @ +5V RL=open (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.19. Plot of Output Voltage Low 1 @ +5V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 43 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.19. Raw data for Output Voltage Low 1 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 4.06E-03 4.62E-03 4.41E-03 4.55E-03 4.20E-03 4.94E-03 4.20E-03 4.30E-03 4.31E-03 4.04E-03 4.25E-03 4.63E-03 20 4.84E-03 4.46E-03 4.92E-03 5.02E-03 4.87E-03 4.43E-03 5.19E-03 4.62E-03 4.85E-03 4.90E-03 4.58E-03 4.58E-03 50 4.95E-03 5.04E-03 5.31E-03 5.32E-03 5.26E-03 5.34E-03 4.73E-03 5.22E-03 5.31E-03 5.27E-03 4.65E-03 4.57E-03 100 6.23E-03 5.91E-03 5.98E-03 5.90E-03 5.98E-03 6.77E-03 6.69E-03 6.45E-03 6.54E-03 6.64E-03 4.85E-03 4.63E-03 4.37E-03 2.35E-04 5.01E-03 3.72E-03 4.82E-03 2.14E-04 5.41E-03 4.24E-03 5.18E-03 1.70E-04 5.64E-03 4.71E-03 6.00E-03 1.34E-04 6.37E-03 5.63E-03 4.36E-03 4.80E-03 5.17E-03 6.62E-03 3.43E-04 2.89E-04 2.52E-04 1.26E-04 5.30E-03 5.59E-03 5.87E-03 6.96E-03 3.42E-03 4.01E-03 4.48E-03 6.27E-03 6.00E-03 6.00E-03 1.30E-02 2.00E-02 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 44 Output Voltage Low 2 @ +5V RL=open (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.20. Plot of Output Voltage Low 2 @ +5V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 45 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.20. Raw data for Output Voltage Low 2 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 4.31E-03 4.38E-03 3.94E-03 5.00E-03 4.28E-03 4.08E-03 4.14E-03 3.86E-03 4.23E-03 4.33E-03 4.25E-03 3.96E-03 20 4.84E-03 4.75E-03 4.67E-03 4.62E-03 4.68E-03 4.78E-03 4.33E-03 4.48E-03 4.55E-03 4.46E-03 4.30E-03 4.19E-03 50 4.89E-03 5.34E-03 4.90E-03 5.22E-03 5.17E-03 5.90E-03 5.39E-03 5.02E-03 5.44E-03 5.37E-03 4.79E-03 4.20E-03 100 5.41E-03 5.74E-03 5.91E-03 5.64E-03 5.66E-03 6.72E-03 6.44E-03 6.17E-03 6.54E-03 6.69E-03 4.45E-03 4.30E-03 4.38E-03 3.85E-04 5.44E-03 3.33E-03 4.71E-03 8.53E-05 4.95E-03 4.48E-03 5.10E-03 2.01E-04 5.65E-03 4.55E-03 5.67E-03 1.81E-04 6.17E-03 5.18E-03 4.13E-03 4.52E-03 5.42E-03 6.51E-03 1.77E-04 1.66E-04 3.14E-04 2.22E-04 4.61E-03 4.97E-03 6.28E-03 7.12E-03 3.64E-03 4.07E-03 4.56E-03 5.90E-03 6.00E-03 6.00E-03 1.30E-02 2.00E-02 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 46 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Output Voltage Low 1 @ +5V RL=2kΩ (V) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.21. Plot of Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 47 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.21. Raw data for Output Voltage Low 1 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.05E-03 9.70E-04 1.05E-03 8.80E-04 9.30E-04 8.90E-04 9.80E-04 8.70E-04 9.80E-04 1.04E-03 1.03E-03 9.00E-04 20 7.90E-04 9.00E-04 7.90E-04 8.80E-04 9.00E-04 9.80E-04 9.50E-04 1.04E-03 9.40E-04 1.05E-03 1.04E-03 8.10E-04 50 7.00E-04 9.00E-04 8.40E-04 8.60E-04 6.70E-04 7.50E-04 8.20E-04 9.30E-04 9.10E-04 7.70E-04 8.40E-04 8.20E-04 100 6.40E-04 6.80E-04 7.40E-04 6.70E-04 6.50E-04 6.20E-04 5.30E-04 6.90E-04 8.10E-04 8.10E-04 9.30E-04 9.20E-04 9.76E-04 7.47E-05 1.18E-03 7.71E-04 8.52E-04 5.72E-05 1.01E-03 6.95E-04 7.94E-04 1.02E-04 1.07E-03 5.13E-04 6.76E-04 3.91E-05 7.83E-04 5.69E-04 9.52E-04 9.92E-04 8.36E-04 6.92E-04 7.05E-05 5.07E-05 8.11E-05 1.22E-04 1.15E-03 1.13E-03 1.06E-03 1.03E-03 7.59E-04 8.53E-04 6.14E-04 3.58E-04 2.00E-03 2.00E-03 2.00E-03 2.00E-03 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 48 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Output Voltage Low 2 @ +5V RL=2kΩ (V) 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.22. Plot of Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 49 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.22. Raw data for Output Voltage Low 2 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 7.50E-04 7.80E-04 9.10E-04 9.80E-04 8.30E-04 9.60E-04 8.60E-04 1.03E-03 1.00E-03 6.80E-04 9.40E-04 9.20E-04 20 9.30E-04 6.80E-04 9.80E-04 8.60E-04 9.20E-04 6.60E-04 8.00E-04 8.90E-04 8.20E-04 8.20E-04 8.90E-04 8.30E-04 50 9.10E-04 5.90E-04 9.60E-04 9.30E-04 8.40E-04 9.10E-04 9.20E-04 9.20E-04 9.20E-04 8.50E-04 9.80E-04 9.10E-04 100 7.50E-04 7.80E-04 6.00E-04 7.50E-04 7.00E-04 7.00E-04 8.70E-04 8.40E-04 7.60E-04 6.10E-04 8.40E-04 6.90E-04 8.50E-04 9.46E-05 1.11E-03 5.91E-04 8.74E-04 1.17E-04 1.19E-03 5.54E-04 8.46E-04 1.50E-04 1.26E-03 4.35E-04 7.16E-04 7.09E-05 9.10E-04 5.22E-04 9.06E-04 7.98E-04 9.04E-04 7.56E-04 1.42E-04 8.44E-05 3.05E-05 1.05E-04 1.29E-03 1.03E-03 9.88E-04 1.05E-03 5.17E-04 5.67E-04 8.20E-04 4.67E-04 2.00E-03 2.00E-03 2.00E-03 2.00E-03 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 50 Output Voltage Low 1 @ +5V IL=100uA (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.80E-01 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.23. Plot of Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 51 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.23. Raw data for Output Voltage Low 1 @ +5V IL=100uA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +5V IL=100uA (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 8.66E-02 8.77E-02 8.63E-02 8.74E-02 8.88E-02 8.84E-02 8.71E-02 8.54E-02 8.55E-02 8.62E-02 8.71E-02 8.88E-02 20 8.94E-02 9.10E-02 8.93E-02 9.05E-02 9.17E-02 9.18E-02 8.96E-02 8.83E-02 8.91E-02 8.94E-02 8.83E-02 8.95E-02 50 9.42E-02 9.49E-02 9.29E-02 9.42E-02 9.63E-02 9.63E-02 9.39E-02 9.27E-02 9.37E-02 9.35E-02 8.83E-02 8.87E-02 100 1.01E-01 1.02E-01 1.00E-01 1.02E-01 1.02E-01 1.04E-01 1.01E-01 1.00E-01 1.01E-01 1.01E-01 8.78E-02 8.88E-02 8.74E-02 1.00E-03 9.01E-02 8.46E-02 9.04E-02 1.03E-03 9.32E-02 8.76E-02 9.45E-02 1.25E-03 9.79E-02 9.10E-02 1.02E-01 9.23E-04 1.04E-01 9.90E-02 8.65E-02 8.97E-02 9.40E-02 1.02E-01 1.25E-03 1.28E-03 1.37E-03 1.60E-03 8.99E-02 9.32E-02 9.78E-02 1.06E-01 8.31E-02 8.61E-02 9.03E-02 9.72E-02 1.30E-01 1.30E-01 1.50E-01 1.60E-01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 52 Output Voltage Low 2 @ +5V IL=100uA (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.80E-01 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.24. Plot of Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 53 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.24. Raw data for Output Voltage Low 2 @ +5V IL=100uA (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +5V IL=100uA (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 8.45E-02 8.54E-02 8.38E-02 8.46E-02 8.65E-02 8.64E-02 8.67E-02 8.19E-02 8.17E-02 8.56E-02 8.50E-02 8.78E-02 20 8.69E-02 8.78E-02 8.72E-02 8.71E-02 8.89E-02 8.92E-02 8.95E-02 8.41E-02 8.50E-02 8.90E-02 8.55E-02 8.81E-02 50 9.11E-02 9.18E-02 9.12E-02 9.14E-02 9.38E-02 9.40E-02 9.38E-02 8.85E-02 8.94E-02 9.34E-02 8.55E-02 8.80E-02 100 9.78E-02 9.88E-02 9.76E-02 9.81E-02 1.01E-01 1.01E-01 1.01E-01 9.67E-02 9.64E-02 1.01E-01 8.57E-02 8.78E-02 8.49E-02 1.02E-03 8.77E-02 8.21E-02 8.76E-02 8.04E-04 8.98E-02 8.54E-02 9.18E-02 1.11E-03 9.49E-02 8.88E-02 9.86E-02 1.32E-03 1.02E-01 9.50E-02 8.45E-02 8.73E-02 9.18E-02 9.93E-02 2.48E-03 2.58E-03 2.63E-03 2.50E-03 9.13E-02 9.44E-02 9.90E-02 1.06E-01 7.77E-02 8.03E-02 8.46E-02 9.24E-02 1.30E-01 1.30E-01 1.50E-01 1.60E-01 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 54 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +5V RL=open (V) 4.40E+00 4.38E+00 4.36E+00 4.34E+00 4.32E+00 4.30E+00 4.28E+00 4.26E+00 4.24E+00 4.22E+00 4.20E+00 4.18E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.25. Plot of Output Voltage High 1 @ +5V RL=open (V) versus total dose. The data show significant degradation with radiation at the 100krad(Si) read point, however the parameter remains within specification even after application of the KTLs statistics. Note that this part is only guaranteed by the manufacturer to 75krad(Si). The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 55 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.25. Raw data for Output Voltage High 1 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +5V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 4.36E+00 4.36E+00 4.35E+00 4.35E+00 4.36E+00 4.36E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.36E+00 4.36E+00 20 4.37E+00 4.36E+00 4.36E+00 4.36E+00 4.37E+00 4.37E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 4.36E+00 50 4.38E+00 4.38E+00 4.37E+00 4.38E+00 4.38E+00 4.38E+00 4.37E+00 4.38E+00 4.38E+00 4.37E+00 4.36E+00 4.36E+00 100 4.39E+00 4.31E+00 4.38E+00 4.38E+00 4.34E+00 4.38E+00 4.27E+00 4.39E+00 4.39E+00 4.39E+00 4.36E+00 4.36E+00 4.35E+00 3.70E-03 4.36E+00 4.34E+00 4.36E+00 4.47E-03 4.38E+00 4.35E+00 4.38E+00 6.11E-03 4.39E+00 4.36E+00 4.36E+00 3.48E-02 4.46E+00 4.27E+00 4.35E+00 4.36E+00 4.38E+00 4.36E+00 1.79E-03 2.74E-03 5.76E-03 5.38E-02 4.36E+00 4.37E+00 4.39E+00 4.51E+00 4.35E+00 4.36E+00 4.36E+00 4.21E+00 4.20E+00 4.20E+00 4.20E+00 4.20E+00 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 56 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +5V RL=open (V) 4.50E+00 4.45E+00 4.40E+00 4.35E+00 4.30E+00 4.25E+00 4.20E+00 4.15E+00 4.10E+00 4.05E+00 4.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.26. Plot of Output Voltage High 2 @ +5V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 57 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.26. Raw data for Output Voltage High 2 @ +5V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +5V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 4.35E+00 4.34E+00 4.34E+00 4.34E+00 4.35E+00 4.34E+00 4.35E+00 4.34E+00 4.34E+00 4.35E+00 4.34E+00 4.35E+00 20 4.36E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.35E+00 4.36E+00 4.35E+00 4.36E+00 50 4.37E+00 4.36E+00 4.35E+00 4.36E+00 4.37E+00 4.37E+00 4.37E+00 4.36E+00 4.36E+00 4.37E+00 4.35E+00 4.36E+00 100 4.39E+00 4.39E+00 4.38E+00 4.39E+00 4.39E+00 4.39E+00 4.39E+00 4.39E+00 4.39E+00 4.39E+00 4.35E+00 4.35E+00 4.34E+00 4.27E-03 4.36E+00 4.33E+00 4.35E+00 4.44E-03 4.36E+00 4.34E+00 4.36E+00 5.07E-03 4.38E+00 4.35E+00 4.39E+00 3.11E-03 4.40E+00 4.38E+00 4.34E+00 4.35E+00 4.36E+00 4.39E+00 3.56E-03 3.65E-03 3.49E-03 2.41E-03 4.35E+00 4.36E+00 4.37E+00 4.40E+00 4.34E+00 4.34E+00 4.35E+00 4.38E+00 4.20E+00 4.20E+00 4.20E+00 4.20E+00 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 58 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +5V RL=2kΩ (V) 3.95E+00 3.90E+00 3.85E+00 3.80E+00 3.75E+00 3.70E+00 3.65E+00 3.60E+00 3.55E+00 3.50E+00 3.45E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.27. Plot of Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose. The data show significant degradation with radiation at the 100krad(Si) read point, however the parameter remains within specification even after application of the KTLs statistics. Note that this part is only guaranteed by the manufacturer to 75krad(Si). The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 59 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.27. Raw data for Output Voltage High 1 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +5V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 3.91E+00 3.89E+00 3.89E+00 3.89E+00 3.89E+00 3.89E+00 3.91E+00 3.92E+00 3.92E+00 3.91E+00 3.89E+00 3.91E+00 20 3.91E+00 3.89E+00 3.89E+00 3.89E+00 3.89E+00 3.89E+00 3.91E+00 3.91E+00 3.91E+00 3.90E+00 3.89E+00 3.91E+00 50 3.90E+00 3.88E+00 3.88E+00 3.88E+00 3.88E+00 3.88E+00 3.90E+00 3.91E+00 3.91E+00 3.90E+00 3.90E+00 3.91E+00 100 3.89E+00 3.87E+00 3.87E+00 3.87E+00 3.87E+00 3.79E+00 3.89E+00 3.90E+00 3.90E+00 3.89E+00 3.90E+00 3.91E+00 3.90E+00 8.58E-03 3.92E+00 3.87E+00 3.89E+00 9.06E-03 3.92E+00 3.87E+00 3.89E+00 8.90E-03 3.91E+00 3.86E+00 3.88E+00 9.84E-03 3.90E+00 3.85E+00 3.91E+00 3.90E+00 3.90E+00 3.87E+00 1.20E-02 1.14E-02 1.24E-02 4.52E-02 3.94E+00 3.94E+00 3.93E+00 4.00E+00 3.88E+00 3.87E+00 3.86E+00 3.75E+00 3.50E+00 3.50E+00 3.50E+00 3.50E+00 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 60 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +5V RL=2kΩ (V) 4.00E+00 3.95E+00 3.90E+00 3.85E+00 3.80E+00 3.75E+00 3.70E+00 3.65E+00 3.60E+00 3.55E+00 3.50E+00 3.45E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.28. Plot of Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 61 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.28. Raw data for Output Voltage High 2 @ +5V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +5V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 3.95E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.96E+00 3.95E+00 3.95E+00 3.93E+00 3.94E+00 20 3.94E+00 3.92E+00 3.92E+00 3.93E+00 3.92E+00 3.92E+00 3.94E+00 3.95E+00 3.95E+00 3.94E+00 3.93E+00 3.94E+00 50 3.94E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.94E+00 3.94E+00 3.93E+00 3.94E+00 3.94E+00 100 3.93E+00 3.91E+00 3.91E+00 3.91E+00 3.91E+00 3.90E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.94E+00 3.93E+00 7.95E-03 3.95E+00 3.91E+00 3.93E+00 8.61E-03 3.95E+00 3.90E+00 3.92E+00 8.61E-03 3.94E+00 3.90E+00 3.91E+00 9.34E-03 3.94E+00 3.89E+00 3.95E+00 3.94E+00 3.93E+00 3.92E+00 1.07E-02 1.05E-02 1.09E-02 1.16E-02 3.97E+00 3.97E+00 3.96E+00 3.95E+00 3.92E+00 3.91E+00 3.90E+00 3.89E+00 3.50E+00 3.50E+00 3.50E+00 3.50E+00 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 62 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Positive Slew Rate 1 @ +5V (V/us) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.29. Plot of Positive Slew Rate 1 @ +5V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 63 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.29. Raw data for Positive Slew Rate 1 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 1 @ +5V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.50E-02 8.30E-02 8.60E-02 8.20E-02 7.80E-02 8.00E-02 8.40E-02 8.90E-02 8.90E-02 8.30E-02 8.20E-02 7.90E-02 20 8.10E-02 7.80E-02 8.20E-02 7.80E-02 7.40E-02 7.60E-02 7.90E-02 8.50E-02 8.40E-02 7.80E-02 8.10E-02 7.90E-02 50 7.60E-02 7.40E-02 7.60E-02 7.20E-02 6.80E-02 7.00E-02 7.40E-02 7.90E-02 7.80E-02 7.20E-02 8.20E-02 8.00E-02 100 8.90E-02 7.10E-02 7.50E-02 6.20E-02 6.00E-02 5.60E-02 6.20E-02 8.70E-02 7.10E-02 6.10E-02 8.20E-02 8.00E-02 8.28E-02 3.11E-03 9.13E-02 7.43E-02 7.86E-02 3.13E-03 8.72E-02 7.00E-02 7.32E-02 3.35E-03 8.24E-02 6.40E-02 7.14E-02 1.16E-02 1.03E-01 3.95E-02 8.50E-02 8.04E-02 7.46E-02 6.74E-02 3.94E-03 3.91E-03 3.85E-03 1.22E-02 9.58E-02 9.11E-02 8.51E-02 1.01E-01 7.42E-02 6.97E-02 6.41E-02 3.39E-02 4.00E-02 4.00E-02 2.00E-02 1.00E-02 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 64 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Positive Slew Rate 2 @ +5V (V/us) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.30. Plot of Positive Slew Rate 2 @ +5V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 65 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.30. Raw data for Positive Slew Rate 2 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 2 @ +5V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.50E-02 8.30E-02 8.60E-02 8.20E-02 7.80E-02 8.10E-02 8.40E-02 9.00E-02 8.90E-02 8.40E-02 8.10E-02 7.90E-02 20 8.10E-02 7.90E-02 8.20E-02 7.80E-02 7.50E-02 7.60E-02 8.00E-02 8.60E-02 8.40E-02 7.90E-02 8.10E-02 8.00E-02 50 7.60E-02 7.30E-02 7.70E-02 7.20E-02 7.00E-02 6.70E-02 7.40E-02 7.90E-02 7.70E-02 7.30E-02 8.20E-02 8.00E-02 100 8.20E-02 6.30E-02 7.80E-02 6.30E-02 6.10E-02 5.70E-02 7.10E-02 7.50E-02 7.00E-02 6.10E-02 8.20E-02 8.00E-02 8.28E-02 3.11E-03 9.13E-02 7.43E-02 7.90E-02 2.74E-03 8.65E-02 7.15E-02 7.36E-02 2.88E-03 8.15E-02 6.57E-02 6.94E-02 9.81E-03 9.63E-02 4.25E-02 8.56E-02 8.10E-02 7.40E-02 6.68E-02 3.78E-03 4.00E-03 4.58E-03 7.50E-03 9.60E-02 9.20E-02 8.66E-02 8.74E-02 7.52E-02 7.00E-02 6.14E-02 4.62E-02 4.00E-02 4.00E-02 2.00E-02 1.00E-02 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 66 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Slew Rate 1 @ +5V (V/us) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.31. Plot of Negative Slew Rate 1 @ +5V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 67 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.31. Raw data for Negative Slew Rate 1 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 1 @ +5V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -5.20E-02 -5.10E-02 -5.30E-02 -5.10E-02 -4.80E-02 -4.90E-02 -5.10E-02 -5.50E-02 -5.40E-02 -5.20E-02 -5.00E-02 -4.80E-02 20 -4.90E-02 -4.90E-02 -5.00E-02 -4.80E-02 -4.70E-02 -4.60E-02 -4.90E-02 -5.40E-02 -5.20E-02 -4.90E-02 -4.90E-02 -5.00E-02 50 -3.90E-02 -4.70E-02 -4.80E-02 -4.50E-02 -4.30E-02 -4.30E-02 -4.80E-02 -5.10E-02 -4.90E-02 -4.70E-02 -5.10E-02 -4.80E-02 100 -4.00E-02 -3.90E-02 -4.00E-02 -3.90E-02 -3.60E-02 -3.30E-02 -3.70E-02 -4.20E-02 -4.00E-02 -3.80E-02 -5.00E-02 -4.80E-02 -5.10E-02 1.87E-03 -4.59E-02 -5.61E-02 -4.86E-02 1.14E-03 -4.55E-02 -5.17E-02 -4.44E-02 3.58E-03 -3.46E-02 -5.42E-02 -3.88E-02 1.64E-03 -3.43E-02 -4.33E-02 -5.22E-02 -5.00E-02 -4.76E-02 -3.80E-02 2.39E-03 3.08E-03 2.97E-03 3.39E-03 -4.57E-02 -4.15E-02 -3.95E-02 -2.87E-02 -5.87E-02 -5.85E-02 -5.57E-02 -4.73E-02 -4.00E-02 -4.00E-02 -2.00E-02 -1.00E-02 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 68 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Slew Rate 2 @ +5V (V/us) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 0 10 20 30 40 50 60 70 80 90 Total Dose (krad(Si)) Figure 5.32. Plot of Negative Slew Rate 2 @ +5V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 69 100 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.32. Raw data for Negative Slew Rate 2 @ +5V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 2 @ +5V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -5.20E-02 -5.10E-02 -5.40E-02 -5.10E-02 -4.90E-02 -5.00E-02 -5.10E-02 -5.50E-02 -5.50E-02 -5.10E-02 -5.00E-02 -4.90E-02 20 -4.90E-02 -4.80E-02 -5.10E-02 -4.80E-02 -4.50E-02 -4.70E-02 -4.90E-02 -5.40E-02 -5.30E-02 -4.80E-02 -5.00E-02 -5.00E-02 50 -4.70E-02 -4.50E-02 -4.70E-02 -4.60E-02 -4.30E-02 -4.40E-02 -4.70E-02 -5.20E-02 -5.20E-02 -4.60E-02 -5.20E-02 -4.90E-02 100 -4.10E-02 -3.90E-02 -4.10E-02 -3.90E-02 -3.60E-02 -3.50E-02 -3.80E-02 -4.10E-02 -4.10E-02 -3.80E-02 -5.10E-02 -4.90E-02 -5.14E-02 1.82E-03 -4.64E-02 -5.64E-02 -4.82E-02 2.17E-03 -4.23E-02 -5.41E-02 -4.56E-02 1.67E-03 -4.10E-02 -5.02E-02 -3.92E-02 2.05E-03 -3.36E-02 -4.48E-02 -5.24E-02 -5.02E-02 -4.82E-02 -3.86E-02 2.41E-03 3.11E-03 3.63E-03 2.51E-03 -4.58E-02 -4.17E-02 -3.82E-02 -3.17E-02 -5.90E-02 -5.87E-02 -5.82E-02 -4.55E-02 -4.00E-02 -4.00E-02 -2.00E-02 -1.00E-02 PASS PASS PASS PASS An ISO 9001:2000 Certified Company 70 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Supply Current @+15V (A) 2.50E-04 2.00E-04 1.50E-04 1.00E-04 5.00E-05 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.33. Plot of Positive Supply Current @ +15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 71 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.33. Raw data for Positive Supply Current @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 1.04E-04 9.70E-05 1.09E-04 1.02E-04 9.60E-05 1.03E-04 1.04E-04 1.06E-04 1.07E-04 1.00E-04 1.03E-04 9.70E-05 20 9.70E-05 1.01E-04 1.00E-04 9.70E-05 9.70E-05 8.80E-05 1.05E-04 1.03E-04 1.01E-04 9.70E-05 9.80E-05 9.50E-05 50 9.50E-05 8.40E-05 9.70E-05 9.00E-05 8.70E-05 8.10E-05 8.70E-05 9.00E-05 9.30E-05 9.10E-05 9.90E-05 9.70E-05 100 7.50E-05 8.00E-05 7.90E-05 7.90E-05 6.80E-05 6.40E-05 7.90E-05 7.70E-05 7.20E-05 7.70E-05 1.00E-04 9.90E-05 200 4.90E-05 5.40E-05 6.30E-05 5.60E-05 4.60E-05 4.60E-05 4.80E-05 5.50E-05 5.50E-05 5.30E-05 9.70E-05 1.01E-04 1.02E-04 5.32E-06 1.16E-04 8.70E-05 9.84E-05 1.95E-06 1.04E-04 9.31E-05 9.06E-05 5.41E-06 1.05E-04 7.58E-05 7.62E-05 4.97E-06 8.98E-05 6.26E-05 5.36E-05 6.58E-06 7.16E-05 3.56E-05 1.04E-04 9.88E-05 8.84E-05 7.38E-05 5.14E-05 2.74E-06 6.72E-06 4.67E-06 6.06E-06 4.16E-06 1.12E-04 1.17E-04 1.01E-04 9.04E-05 6.28E-05 9.65E-05 8.04E-05 7.56E-05 5.72E-05 4.00E-05 2.00E-04 2.00E-04 2.00E-04 2.00E-04 2.00E-04 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 72 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Negative Supply Current @+15V (A) 0.00E+00 -5.00E-05 -1.00E-04 -1.50E-04 -2.00E-04 -2.50E-04 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.34. Plot of Negative Supply Current @ +15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 73 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.34. Raw data for Negative Supply Current @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.02E-04 -1.00E-04 -1.08E-04 -1.04E-04 -9.80E-05 -9.80E-05 -1.03E-04 -1.08E-04 -1.09E-04 -1.03E-04 -1.01E-04 -9.60E-05 20 -9.50E-05 -9.50E-05 -1.04E-04 -9.90E-05 -9.30E-05 -9.20E-05 -9.70E-05 -1.04E-04 -1.02E-04 -9.50E-05 -1.01E-04 -9.60E-05 50 -8.70E-05 -8.80E-05 -9.40E-05 -8.80E-05 -8.40E-05 -8.10E-05 -8.70E-05 -9.30E-05 -9.20E-05 -8.60E-05 -1.02E-04 -9.80E-05 100 -7.80E-05 -7.50E-05 -8.10E-05 -7.60E-05 -7.30E-05 -6.60E-05 -7.30E-05 -7.70E-05 -7.70E-05 -7.20E-05 -1.02E-04 -9.70E-05 200 -5.50E-05 -5.40E-05 -5.70E-05 -5.60E-05 -5.20E-05 -4.50E-05 -5.10E-05 -5.40E-05 -5.40E-05 -4.80E-05 -1.02E-04 -9.80E-05 -1.02E-04 3.85E-06 -9.19E-05 -1.13E-04 -9.72E-05 4.38E-06 -8.52E-05 -1.09E-04 -8.82E-05 3.63E-06 -7.82E-05 -9.82E-05 -7.66E-05 3.05E-06 -6.82E-05 -8.50E-05 -5.48E-05 1.92E-06 -4.95E-05 -6.01E-05 -1.04E-04 -9.80E-05 -8.78E-05 -7.30E-05 -5.04E-05 4.44E-06 4.95E-06 4.87E-06 4.53E-06 3.91E-06 -9.20E-05 -8.44E-05 -7.45E-05 -6.06E-05 -3.97E-05 -1.16E-04 -1.12E-04 -1.01E-04 -8.54E-05 -6.11E-05 -2.00E-04 -2.00E-04 -2.00E-04 -2.00E-04 -2.00E-04 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 74 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 1 @ +15V (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.35. Plot of Input Offset Voltage 1 @ +15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 75 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.35. Raw data for Input Offset Voltage 1 @ +15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 1 @ +15V (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.61E-05 5.05E-05 5.01E-05 -2.38E-05 4.76E-05 8.17E-05 7.51E-05 -6.60E-05 2.91E-06 -9.29E-06 -6.87E-06 -3.42E-05 20 -3.96E-05 1.75E-05 1.23E-05 -4.32E-05 2.40E-05 5.62E-05 5.06E-05 -9.32E-05 -2.90E-05 -3.43E-05 -6.52E-06 -3.36E-05 50 -4.15E-05 3.93E-05 7.38E-06 -3.43E-05 2.78E-05 5.83E-05 5.39E-05 1.15E-04 -3.65E-05 -2.90E-05 -6.51E-06 -3.14E-05 100 -1.54E-05 7.77E-05 3.41E-05 1.74E-05 5.57E-05 1.09E-04 9.34E-05 1.14E-04 -1.39E-05 1.84E-05 -4.58E-06 -3.09E-05 200 8.71E-05 1.73E-04 1.02E-04 1.76E-04 1.81E-04 2.97E-04 2.55E-04 -2.54E-05 9.09E-05 1.97E-04 -9.05E-06 -3.26E-05 2.17E-05 3.81E-05 1.26E-04 -8.27E-05 -5.80E-06 3.28E-05 8.42E-05 -9.58E-05 -2.82E-07 3.63E-05 9.92E-05 -9.98E-05 3.39E-05 3.57E-05 1.32E-04 -6.40E-05 1.44E-04 4.54E-05 2.68E-04 1.94E-05 1.69E-05 -9.95E-06 3.23E-05 6.41E-05 1.63E-04 6.19E-05 6.31E-05 6.40E-05 5.81E-05 1.31E-04 1.87E-04 1.63E-04 2.08E-04 2.23E-04 5.21E-04 -1.53E-04 -1.83E-04 -1.43E-04 -9.51E-05 -1.95E-04 -3.50E-04 -3.50E-04 -6.50E-04 -1.00E-03 -1.00E-03 PASS PASS PASS PASS PASS 3.50E-04 3.50E-04 6.50E-04 1.00E-03 1.00E-03 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 76 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage 2 @ +15V (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.36. Plot of Input Offset Voltage 2 @ +15V (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 77 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.36. Raw data for Input Offset Voltage 2 @ +15V (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage 2 @ +15V (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.61E-05 -3.57E-05 -5.03E-05 1.32E-05 4.01E-05 -3.88E-05 -5.61E-05 -5.01E-05 1.27E-05 3.87E-05 -4.35E-05 -6.41E-05 20 -6.19E-05 -6.12E-05 -8.45E-05 -8.82E-06 1.62E-05 -7.00E-05 -8.15E-05 -7.82E-05 -7.37E-06 5.55E-06 -4.27E-05 -6.48E-05 50 -6.44E-05 -6.42E-05 -9.27E-05 1.29E-07 2.28E-05 -6.36E-05 -7.72E-05 -9.48E-05 7.25E-06 6.17E-06 -4.26E-05 -6.18E-05 100 -5.34E-05 -3.75E-05 -6.85E-05 3.99E-05 5.42E-05 -3.28E-05 -3.38E-05 -8.02E-05 1.17E-04 3.50E-05 -4.26E-05 -6.12E-05 200 3.99E-05 7.21E-05 3.24E-05 1.61E-04 1.88E-04 1.41E-04 1.05E-04 3.27E-06 5.05E-04 1.84E-04 -4.38E-05 -6.19E-05 -1.38E-05 3.86E-05 9.20E-05 -1.20E-04 -4.01E-05 4.20E-05 7.50E-05 -1.55E-04 -3.97E-05 4.88E-05 9.41E-05 -1.73E-04 -1.31E-05 5.62E-05 1.41E-04 -1.67E-04 9.85E-05 7.13E-05 2.94E-04 -9.69E-05 -1.87E-05 -4.63E-05 -4.44E-05 9.50E-07 1.88E-04 4.20E-05 4.19E-05 4.80E-05 7.66E-05 1.89E-04 9.65E-05 6.86E-05 8.71E-05 2.11E-04 7.07E-04 -1.34E-04 -1.61E-04 -1.76E-04 -2.09E-04 -3.32E-04 -3.50E-04 -3.50E-04 -6.50E-04 -1.00E-03 -1.00E-03 PASS PASS PASS PASS PASS 3.50E-04 3.50E-04 6.50E-04 1.00E-03 1.00E-03 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 78 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 1 @ +15V (A) 3.00E-08 2.00E-08 1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 -3.00E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.37. Plot of Input Offset Current 1 @ +15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 79 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.37. Raw data for Input Offset Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 1 @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -9.00E-11 -5.00E-11 -2.10E-10 -1.10E-10 -8.00E-11 -8.00E-11 3.00E-11 -1.20E-10 -1.30E-10 1.00E-11 4.00E-11 2.00E-11 20 -5.00E-10 -8.00E-11 2.00E-11 -1.40E-10 -3.50E-10 -9.00E-11 -3.00E-11 -2.20E-10 0.00E+00 2.00E-11 -2.00E-11 6.00E-11 50 -4.90E-10 -4.00E-11 -1.40E-10 -1.40E-10 -1.40E-10 -1.30E-10 -2.80E-10 -1.60E-10 -1.00E-10 -6.00E-11 5.00E-11 -4.00E-11 100 -6.00E-10 -3.00E-11 -3.50E-10 -7.00E-11 -3.00E-10 -2.50E-10 -2.30E-10 -4.00E-10 -2.80E-10 -4.00E-11 5.00E-11 -3.00E-11 200 -5.30E-10 -3.90E-10 -4.20E-10 2.40E-10 4.00E-11 -4.50E-10 -5.30E-10 -5.40E-10 -9.90E-10 1.00E-10 3.00E-11 -3.00E-11 -1.08E-10 6.10E-11 5.92E-11 -2.75E-10 -2.10E-10 2.11E-10 3.69E-10 -7.89E-10 -1.90E-10 1.73E-10 2.85E-10 -6.65E-10 -2.70E-10 2.31E-10 3.64E-10 -9.04E-10 -2.12E-10 3.33E-10 7.01E-10 -1.13E-09 -5.80E-11 -6.40E-11 -1.46E-10 -2.40E-10 -4.82E-10 7.40E-11 9.66E-11 8.35E-11 1.30E-10 3.88E-10 1.45E-10 2.01E-10 8.31E-11 1.16E-10 5.83E-10 -2.61E-10 -3.29E-10 -3.75E-10 -5.96E-10 -1.55E-09 -8.00E-10 -2.00E-09 -1.30E-08 -2.30E-08 -2.30E-08 PASS PASS PASS PASS PASS 8.00E-10 2.00E-09 1.30E-08 2.30E-08 2.30E-08 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 80 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current 2 @ +15V (A) 3.00E-08 2.00E-08 1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 -3.00E-08 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.38. Plot of Input Offset Current 2 @ +15V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 81 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.38. Raw data for Input Offset Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current 2 @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -4.00E-11 -3.00E-11 -1.00E-10 -2.00E-10 -1.80E-10 -3.00E-11 -1.30E-10 -1.20E-10 3.00E-11 -9.00E-11 -1.80E-10 -5.00E-11 20 1.80E-10 -2.60E-10 -6.00E-11 -7.00E-11 -6.00E-11 0.00E+00 -4.00E-11 -9.00E-11 -3.20E-10 -3.20E-10 -7.00E-11 3.00E-11 50 1.30E-10 -1.50E-10 -2.80E-10 -8.00E-11 -1.70E-10 -1.20E-10 -5.00E-11 -1.30E-10 -9.70E-10 -2.00E-10 -1.50E-10 -1.00E-11 100 -6.00E-11 -4.70E-10 -4.80E-10 -2.20E-10 -1.50E-10 -7.00E-11 2.00E-11 -1.40E-10 -2.90E-09 -1.20E-10 -1.40E-10 0.00E+00 200 0.00E+00 -4.20E-10 -1.70E-10 -1.50E-10 1.10E-10 -9.90E-10 -1.30E-10 -4.90E-10 -8.13E-09 -4.60E-10 -3.00E-11 2.00E-11 -1.10E-10 7.81E-11 1.04E-10 -3.24E-10 -5.40E-11 1.56E-10 3.74E-10 -4.82E-10 -1.10E-10 1.52E-10 3.07E-10 -5.27E-10 -2.76E-10 1.90E-10 2.46E-10 -7.98E-10 -1.26E-10 2.00E-10 4.23E-10 -6.75E-10 -6.80E-11 -1.54E-10 -2.94E-10 -6.42E-10 -2.04E-09 6.72E-11 1.55E-10 3.82E-10 1.26E-09 3.42E-09 1.16E-10 2.71E-10 7.52E-10 2.82E-09 7.33E-09 -2.52E-10 -5.79E-10 -1.34E-09 -4.11E-09 -1.14E-08 -8.00E-10 -2.00E-09 -1.30E-08 -2.30E-08 -2.30E-08 PASS PASS PASS PASS PASS 8.00E-10 2.00E-09 1.30E-08 2.30E-08 2.30E-08 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 82 Positive Input Bias Current 1 @ +15V (A) RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.39. Plot of Positive Input Bias Current 1 @ +15V (A) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 83 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.39. Raw data for Positive Input Bias Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 1 @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 7.28E-09 7.57E-09 8.01E-09 7.58E-09 7.85E-09 7.59E-09 8.23E-09 7.01E-09 7.32E-09 8.51E-09 7.66E-09 8.27E-09 20 1.08E-08 1.08E-08 1.16E-08 1.10E-08 1.16E-08 1.12E-08 1.21E-08 1.08E-08 1.15E-08 1.27E-08 7.72E-09 8.38E-09 50 1.68E-08 1.68E-08 1.77E-08 1.73E-08 1.77E-08 1.72E-08 1.83E-08 1.69E-08 1.82E-08 1.94E-08 7.55E-09 8.32E-09 100 2.74E-08 2.63E-08 2.82E-08 2.66E-08 2.73E-08 2.66E-08 2.89E-08 2.75E-08 2.85E-08 3.01E-08 7.64E-09 8.36E-09 200 4.58E-08 4.33E-08 4.61E-08 4.29E-08 4.41E-08 4.09E-08 4.62E-08 4.52E-08 4.58E-08 4.72E-08 7.65E-09 8.31E-09 7.66E-09 2.82E-10 8.43E-09 6.89E-09 1.11E-08 4.21E-10 1.23E-08 9.99E-09 1.72E-08 4.48E-10 1.85E-08 1.60E-08 2.72E-08 7.19E-10 2.91E-08 2.52E-08 4.44E-08 1.43E-09 4.84E-08 4.05E-08 7.73E-09 1.16E-08 1.80E-08 2.83E-08 4.50E-08 6.25E-10 7.73E-10 9.83E-10 1.32E-09 2.44E-09 9.45E-09 1.37E-08 2.07E-08 3.19E-08 5.17E-08 6.02E-09 9.51E-09 1.53E-08 2.47E-08 3.83E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07 PASS PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.20E-07 1.20E-07 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 84 Positive Input Bias Current 2 @ +15V (A) RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.40. Plot of Positive Input Bias Current 2 @ +15V (A) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 85 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.40. Raw data for Positive Input Bias Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current 2 @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 7.60E-09 7.58E-09 8.05E-09 7.42E-09 7.94E-09 7.62E-09 8.40E-09 7.01E-09 7.35E-09 8.62E-09 7.63E-09 8.36E-09 20 1.14E-08 1.07E-08 1.17E-08 1.12E-08 1.16E-08 1.13E-08 1.21E-08 1.08E-08 1.14E-08 1.27E-08 7.62E-09 8.43E-09 50 1.77E-08 1.65E-08 1.77E-08 1.74E-08 1.77E-08 1.73E-08 1.85E-08 1.71E-08 1.83E-08 1.94E-08 7.64E-09 8.40E-09 100 2.83E-08 2.61E-08 2.83E-08 2.69E-08 2.72E-08 2.69E-08 2.90E-08 2.75E-08 2.89E-08 3.01E-08 7.56E-09 8.43E-09 200 4.67E-08 4.23E-08 4.64E-08 4.31E-08 4.37E-08 4.02E-08 4.59E-08 4.52E-08 4.72E-08 4.66E-08 7.64E-09 8.43E-09 7.72E-09 2.65E-10 8.45E-09 6.99E-09 1.13E-08 3.94E-10 1.24E-08 1.02E-08 1.74E-08 5.09E-10 1.88E-08 1.60E-08 2.73E-08 9.45E-10 2.99E-08 2.47E-08 4.44E-08 1.99E-09 4.99E-08 3.90E-08 7.80E-09 1.17E-08 1.81E-08 2.85E-08 4.50E-08 6.88E-10 7.69E-10 9.45E-10 1.28E-09 2.81E-09 9.69E-09 1.38E-08 2.07E-08 3.20E-08 5.27E-08 5.91E-09 9.55E-09 1.55E-08 2.49E-08 3.73E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07 PASS PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.20E-07 1.20E-07 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 86 Negative Input Bias Current 1 @ +15V (A) RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.41. Plot of Negative Input Bias Current 1 @ +15V (A) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 87 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.41. Raw data for Negative Input Bias Current 1 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 1 @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 7.45E-09 7.49E-09 8.21E-09 7.69E-09 7.95E-09 7.76E-09 8.33E-09 7.26E-09 7.37E-09 8.48E-09 7.58E-09 8.32E-09 20 1.12E-08 1.09E-08 1.16E-08 1.14E-08 1.20E-08 1.13E-08 1.22E-08 1.10E-08 1.16E-08 1.28E-08 7.66E-09 8.31E-09 50 1.75E-08 1.67E-08 1.79E-08 1.74E-08 1.80E-08 1.76E-08 1.87E-08 1.72E-08 1.84E-08 1.95E-08 7.73E-09 8.35E-09 100 2.80E-08 2.65E-08 2.86E-08 2.70E-08 2.76E-08 2.71E-08 2.93E-08 2.80E-08 2.88E-08 2.99E-08 7.69E-09 8.43E-09 200 4.66E-08 4.40E-08 4.64E-08 4.27E-08 4.41E-08 4.16E-08 4.67E-08 4.57E-08 4.67E-08 4.72E-08 7.65E-09 8.35E-09 7.76E-09 3.21E-10 8.64E-09 6.88E-09 1.14E-08 4.22E-10 1.25E-08 1.02E-08 1.75E-08 5.36E-10 1.90E-08 1.60E-08 2.76E-08 8.27E-10 2.98E-08 2.53E-08 4.48E-08 1.71E-09 4.95E-08 4.01E-08 7.84E-09 1.18E-08 1.83E-08 2.86E-08 4.56E-08 5.51E-10 7.20E-10 9.04E-10 1.08E-09 2.30E-09 9.35E-09 1.37E-08 2.08E-08 3.16E-08 5.19E-08 6.33E-09 9.79E-09 1.58E-08 2.56E-08 3.93E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07 PASS PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.20E-07 1.20E-07 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 88 Negative Input Bias Current 2 @ +15V (A) RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.42. Plot of Negative Input Bias Current 2 @ +15V (A) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 89 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.42. Raw data for Negative Input Bias Current 2 @ +15V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current 2 @ +15V (A) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 7.52E-09 7.64E-09 8.19E-09 7.63E-09 8.06E-09 7.75E-09 8.53E-09 7.10E-09 7.43E-09 8.62E-09 7.75E-09 8.36E-09 20 1.13E-08 1.10E-08 1.17E-08 1.12E-08 1.18E-08 1.12E-08 1.22E-08 1.08E-08 1.18E-08 1.30E-08 7.79E-09 8.35E-09 50 1.76E-08 1.67E-08 1.80E-08 1.76E-08 1.79E-08 1.74E-08 1.87E-08 1.71E-08 1.91E-08 1.96E-08 7.66E-09 8.39E-09 100 2.85E-08 2.66E-08 2.88E-08 2.72E-08 2.76E-08 2.70E-08 2.92E-08 2.79E-08 3.18E-08 3.03E-08 7.73E-09 8.41E-09 200 4.69E-08 4.31E-08 4.66E-08 4.30E-08 4.38E-08 4.13E-08 4.63E-08 4.59E-08 5.54E-08 4.71E-08 7.76E-09 8.40E-09 7.81E-09 2.97E-10 8.62E-09 6.99E-09 1.14E-08 3.32E-10 1.23E-08 1.05E-08 1.76E-08 5.27E-10 1.90E-08 1.61E-08 2.77E-08 9.01E-10 3.02E-08 2.52E-08 4.47E-08 1.92E-09 4.99E-08 3.94E-08 7.89E-09 1.18E-08 1.84E-08 2.93E-08 4.72E-08 6.70E-10 8.27E-10 1.10E-09 1.89E-09 5.12E-09 9.72E-09 1.41E-08 2.14E-08 3.44E-08 6.12E-08 6.05E-09 9.52E-09 1.54E-08 2.41E-08 3.31E-08 -1.50E-08 -2.00E-08 -8.00E-08 -1.20E-07 -1.20E-07 PASS PASS PASS PASS PASS 1.50E-08 2.00E-08 8.00E-08 1.20E-07 1.20E-07 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 90 Common Mode Rejection Ratio 1 @ +15V (dB) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.43. Plot of Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 91 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.43. Raw data for Common Mode Rejection Ratio 1 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 1 @ +15V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.13E+02 1.06E+02 1.06E+02 1.06E+02 1.06E+02 1.09E+02 1.09E+02 1.08E+02 1.12E+02 1.07E+02 1.08E+02 1.08E+02 20 1.15E+02 1.05E+02 1.05E+02 1.05E+02 1.05E+02 1.07E+02 1.08E+02 1.06E+02 1.09E+02 1.05E+02 1.08E+02 1.09E+02 50 1.15E+02 1.04E+02 1.04E+02 1.04E+02 1.04E+02 1.05E+02 1.06E+02 1.04E+02 1.08E+02 1.04E+02 1.08E+02 1.08E+02 100 1.14E+02 1.03E+02 1.03E+02 1.04E+02 1.04E+02 1.04E+02 1.05E+02 1.04E+02 1.06E+02 1.04E+02 1.08E+02 1.09E+02 200 1.15E+02 1.05E+02 1.03E+02 1.04E+02 1.04E+02 1.05E+02 1.07E+02 1.04E+02 1.09E+02 1.06E+02 1.08E+02 1.08E+02 1.07E+02 2.83E+00 1.15E+02 9.97E+01 1.07E+02 4.63E+00 1.20E+02 9.43E+01 1.06E+02 4.85E+00 1.19E+02 9.29E+01 1.06E+02 4.45E+00 1.18E+02 9.33E+01 1.06E+02 4.99E+00 1.20E+02 9.26E+01 1.09E+02 1.07E+02 1.05E+02 1.04E+02 1.06E+02 1.83E+00 1.50E+00 1.38E+00 9.68E-01 1.64E+00 1.14E+02 1.11E+02 1.09E+02 1.07E+02 1.11E+02 1.04E+02 1.03E+02 1.02E+02 1.02E+02 1.02E+02 9.70E+01 9.40E+01 9.00E+01 8.60E+01 8.60E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 92 Common Mode Rejection Ratio 2 @ +15V (dB) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.44. Plot of Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 93 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.44. Raw data for Common Mode Rejection Ratio 2 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio 2 @ +15V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.13E+02 1.08E+02 1.10E+02 1.09E+02 1.10E+02 1.09E+02 1.09E+02 1.16E+02 1.12E+02 1.09E+02 1.09E+02 1.12E+02 20 1.10E+02 1.07E+02 1.08E+02 1.07E+02 1.09E+02 1.06E+02 1.07E+02 1.12E+02 1.10E+02 1.06E+02 1.09E+02 1.11E+02 50 1.09E+02 1.05E+02 1.06E+02 1.06E+02 1.07E+02 1.05E+02 1.06E+02 1.09E+02 1.09E+02 1.05E+02 1.09E+02 1.12E+02 100 1.08E+02 1.04E+02 1.05E+02 1.05E+02 1.07E+02 1.03E+02 1.05E+02 1.08E+02 1.16E+02 1.04E+02 1.09E+02 1.12E+02 200 1.08E+02 1.05E+02 1.05E+02 1.05E+02 1.07E+02 1.05E+02 1.07E+02 1.08E+02 1.03E+02 1.06E+02 1.09E+02 1.12E+02 1.10E+02 1.75E+00 1.15E+02 1.05E+02 1.08E+02 1.37E+00 1.12E+02 1.04E+02 1.07E+02 1.45E+00 1.11E+02 1.03E+02 1.06E+02 1.47E+00 1.10E+02 1.02E+02 1.06E+02 1.59E+00 1.10E+02 1.01E+02 1.11E+02 1.08E+02 1.07E+02 1.07E+02 1.05E+02 3.11E+00 2.37E+00 2.24E+00 5.33E+00 1.88E+00 1.19E+02 1.15E+02 1.13E+02 1.22E+02 1.11E+02 1.02E+02 1.02E+02 1.01E+02 9.26E+01 1.00E+02 9.70E+01 9.40E+01 9.00E+01 8.60E+01 8.60E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 94 Power Supply Rejection Ratio 1 @ +15V (dB) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.45. Plot of Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 95 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.45. Raw data for Power Supply Rejection Ratio 1 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 1 @ +15V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.28E+02 1.40E+02 1.38E+02 1.18E+02 1.31E+02 1.29E+02 1.28E+02 1.30E+02 1.33E+02 1.22E+02 1.20E+02 1.27E+02 20 1.22E+02 1.26E+02 1.32E+02 1.18E+02 1.26E+02 1.27E+02 1.28E+02 1.27E+02 1.38E+02 1.28E+02 1.18E+02 1.26E+02 50 1.24E+02 1.22E+02 1.40E+02 1.16E+02 1.28E+02 1.34E+02 1.35E+02 1.25E+02 1.38E+02 1.23E+02 1.20E+02 1.27E+02 100 1.26E+02 1.19E+02 1.39E+02 1.13E+02 1.21E+02 1.25E+02 1.30E+02 1.23E+02 1.29E+02 1.19E+02 1.21E+02 1.21E+02 200 1.24E+02 1.17E+02 1.23E+02 1.10E+02 1.18E+02 1.13E+02 1.22E+02 1.15E+02 1.14E+02 1.12E+02 1.20E+02 1.22E+02 1.31E+02 8.70E+00 1.55E+02 1.07E+02 1.25E+02 5.21E+00 1.39E+02 1.11E+02 1.26E+02 8.96E+00 1.50E+02 1.01E+02 1.24E+02 9.49E+00 1.50E+02 9.76E+01 1.18E+02 5.39E+00 1.33E+02 1.04E+02 1.28E+02 1.29E+02 1.31E+02 1.25E+02 1.15E+02 3.82E+00 4.64E+00 6.31E+00 4.57E+00 4.05E+00 1.39E+02 1.42E+02 1.48E+02 1.38E+02 1.27E+02 1.18E+02 1.17E+02 1.14E+02 1.12E+02 1.04E+02 1.00E+02 1.00E+02 9.80E+01 7.80E+01 7.80E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 96 Power Supply Rejection Ratio 2 @ +15V (dB) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.46. Plot of Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 97 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.46. Raw data for Power Supply Rejection Ratio 2 @ +15V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio 2 @ +15V (dB) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.41E+02 1.38E+02 1.33E+02 1.34E+02 1.40E+02 1.38E+02 1.30E+02 1.28E+02 1.21E+02 1.29E+02 1.27E+02 1.25E+02 20 1.29E+02 1.43E+02 1.42E+02 1.37E+02 1.34E+02 1.28E+02 1.26E+02 1.40E+02 1.24E+02 1.25E+02 1.26E+02 1.28E+02 50 1.23E+02 1.32E+02 1.37E+02 1.28E+02 1.28E+02 1.20E+02 1.26E+02 1.35E+02 1.26E+02 1.22E+02 1.25E+02 1.28E+02 100 1.17E+02 1.27E+02 1.27E+02 1.21E+02 1.24E+02 1.15E+02 1.22E+02 1.20E+02 1.16E+02 1.17E+02 1.23E+02 1.28E+02 200 1.14E+02 1.15E+02 1.13E+02 1.13E+02 1.19E+02 1.10E+02 1.15E+02 1.12E+02 1.08E+02 1.11E+02 1.30E+02 1.27E+02 1.37E+02 3.53E+00 1.47E+02 1.27E+02 1.37E+02 5.74E+00 1.53E+02 1.21E+02 1.30E+02 5.42E+00 1.45E+02 1.15E+02 1.23E+02 4.34E+00 1.35E+02 1.12E+02 1.15E+02 2.34E+00 1.21E+02 1.08E+02 1.29E+02 1.28E+02 1.26E+02 1.18E+02 1.11E+02 6.03E+00 6.57E+00 5.60E+00 2.96E+00 2.61E+00 1.46E+02 1.46E+02 1.41E+02 1.26E+02 1.18E+02 1.13E+02 1.10E+02 1.10E+02 1.10E+02 1.04E+02 1.00E+02 1.00E+02 9.80E+01 7.80E+01 7.80E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 98 Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.47. Plot of Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 99 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.47. Raw data for Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 2.56E+04 2.39E+04 2.99E+04 2.19E+04 2.90E+04 3.56E+04 3.14E+04 3.18E+04 2.70E+04 3.25E+04 2.52E+04 3.22E+04 20 1.90E+04 3.53E+04 3.34E+04 3.00E+04 2.02E+04 3.21E+04 2.89E+04 3.23E+04 3.41E+04 2.14E+04 3.03E+04 2.77E+04 50 3.29E+04 3.25E+04 2.69E+04 2.56E+04 2.46E+04 2.07E+04 2.41E+04 2.89E+04 2.71E+04 2.39E+04 3.23E+04 3.52E+04 100 2.21E+04 1.40E+04 2.37E+04 3.36E+04 2.03E+04 2.43E+04 1.11E+04 2.59E+04 1.89E+04 1.79E+04 2.94E+04 3.51E+04 200 2.56E+04 2.00E+04 8.16E+03 1.95E+04 1.99E+04 1.07E+04 1.03E+04 2.32E+04 1.96E+04 2.20E+04 2.97E+04 2.64E+04 2.60E+04 3.39E+03 3.53E+04 1.68E+04 2.76E+04 7.54E+03 4.83E+04 6.90E+03 2.85E+04 3.92E+03 3.93E+04 1.78E+04 2.28E+04 7.12E+03 4.23E+04 3.25E+03 1.86E+04 6.38E+03 3.61E+04 1.15E+03 3.16E+04 2.98E+04 2.50E+04 1.96E+04 1.72E+04 3.06E+03 5.00E+03 3.16E+03 5.86E+03 6.21E+03 4.00E+04 4.35E+04 3.36E+04 3.57E+04 3.42E+04 2.33E+04 1.60E+04 1.63E+04 3.55E+03 1.29E+02 1.00E+03 1.00E+03 4.00E+02 5.00E+01 5.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 100 Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 4.50E+04 4.00E+04 3.50E+04 3.00E+04 2.50E+04 2.00E+04 1.50E+04 1.00E+04 5.00E+03 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.48. Plot of Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 101 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.48. Raw data for Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 4.04E+04 4.00E+04 4.05E+04 5.02E+04 2.27E+04 3.53E+04 3.12E+04 3.18E+04 3.20E+04 2.92E+04 3.96E+04 2.99E+04 20 2.57E+04 3.62E+04 2.56E+04 2.97E+04 2.15E+04 3.33E+04 3.14E+04 3.72E+04 3.55E+04 1.92E+04 3.86E+04 4.10E+04 50 2.88E+04 3.29E+04 3.65E+04 3.05E+04 2.50E+04 2.56E+04 1.76E+04 3.58E+04 2.66E+04 4.35E+04 3.34E+04 3.99E+04 100 1.61E+04 2.56E+04 1.53E+04 1.57E+04 2.15E+04 2.89E+04 3.21E+04 3.21E+04 1.71E+04 2.07E+04 3.63E+04 3.04E+04 200 3.06E+04 2.34E+04 3.17E+04 1.88E+04 2.79E+04 1.96E+04 3.06E+04 2.01E+04 1.89E+04 2.40E+04 1.00E+05 1.00E+05 3.88E+04 9.96E+03 6.61E+04 1.14E+04 2.77E+04 5.56E+03 4.30E+04 1.25E+04 3.07E+04 4.33E+03 4.26E+04 1.89E+04 1.89E+04 4.53E+03 3.13E+04 6.45E+03 2.65E+04 5.36E+03 4.12E+04 1.18E+04 3.19E+04 3.13E+04 2.98E+04 2.62E+04 2.26E+04 2.22E+03 7.11E+03 1.00E+04 6.91E+03 4.88E+03 3.80E+04 5.08E+04 5.72E+04 4.52E+04 3.60E+04 2.58E+04 1.18E+04 2.40E+03 7.23E+03 9.24E+03 1.00E+03 1.00E+03 4.00E+02 5.00E+01 5.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 102 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.49. Plot of Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 103 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.49. Raw data for Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.55E+03 2.12E+03 2.38E+03 1.62E+03 1.97E+03 1.99E+03 2.13E+03 1.78E+03 1.66E+03 1.78E+03 1.64E+03 1.64E+03 20 1.39E+03 1.87E+03 2.37E+03 1.50E+03 1.81E+03 1.81E+03 1.90E+03 1.70E+03 1.60E+03 1.59E+03 1.66E+03 1.61E+03 50 1.08E+03 1.45E+03 1.78E+03 1.15E+03 1.36E+03 1.39E+03 1.54E+03 1.30E+03 1.26E+03 1.21E+03 1.67E+03 1.63E+03 100 6.64E+02 7.63E+02 9.51E+02 6.67E+02 8.02E+02 6.62E+02 7.97E+02 7.53E+02 7.41E+02 6.18E+02 1.63E+03 1.59E+03 200 2.56E+02 2.83E+02 3.29E+02 2.65E+02 2.93E+02 2.12E+02 2.68E+02 2.51E+02 2.39E+02 1.95E+02 1.57E+03 1.63E+03 1.93E+03 3.48E+02 2.88E+03 9.73E+02 1.79E+03 3.81E+02 2.83E+03 7.43E+02 1.36E+03 2.79E+02 2.13E+03 5.98E+02 7.69E+02 1.18E+02 1.09E+03 4.46E+02 2.85E+02 2.86E+01 3.63E+02 2.07E+02 1.87E+03 1.72E+03 1.34E+03 7.14E+02 2.33E+02 1.87E+02 1.38E+02 1.29E+02 7.27E+01 2.94E+01 2.38E+03 2.10E+03 1.70E+03 9.14E+02 3.14E+02 1.35E+03 1.34E+03 9.88E+02 5.15E+02 1.53E+02 3.00E+02 3.00E+02 1.20E+02 1.50E+01 1.50E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 104 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.50. Plot of Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 105 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.50. Raw data for Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.33E+03 1.54E+03 1.61E+03 1.54E+03 1.48E+03 1.56E+03 1.47E+03 1.42E+03 1.50E+03 1.49E+03 1.50E+03 1.35E+03 20 1.21E+03 1.36E+03 1.42E+03 1.45E+03 1.36E+03 1.29E+03 1.26E+03 1.35E+03 1.36E+03 1.34E+03 1.46E+03 1.26E+03 50 9.40E+02 1.07E+03 1.15E+03 1.09E+03 1.03E+03 1.10E+03 1.06E+03 9.93E+02 1.05E+03 1.01E+03 1.48E+03 1.36E+03 100 6.20E+02 6.99E+02 7.25E+02 7.04E+02 6.76E+02 6.04E+02 6.84E+02 6.39E+02 5.99E+02 6.50E+02 1.43E+03 1.33E+03 200 2.79E+02 3.00E+02 2.94E+02 2.93E+02 2.66E+02 2.12E+02 2.58E+02 2.34E+02 1.89E+02 2.02E+02 1.48E+03 1.35E+03 1.50E+03 1.07E+02 1.79E+03 1.21E+03 1.36E+03 9.48E+01 1.62E+03 1.10E+03 1.05E+03 7.76E+01 1.27E+03 8.42E+02 6.85E+02 4.00E+01 7.94E+02 5.75E+02 2.86E+02 1.36E+01 3.23E+02 2.49E+02 1.49E+03 1.32E+03 1.04E+03 6.35E+02 2.19E+02 5.05E+01 4.27E+01 4.27E+01 3.50E+01 2.76E+01 1.63E+03 1.44E+03 1.16E+03 7.31E+02 2.95E+02 1.35E+03 1.20E+03 9.25E+02 5.39E+02 1.43E+02 3.00E+02 3.00E+02 1.20E+02 1.50E+01 1.50E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 106 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +15V RL=open (V) 1.44E+01 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.51. Plot of Output Voltage High 1 @ +15V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 107 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.51. Raw data for Output Voltage High 1 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +15V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 20 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 50 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 100 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 200 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 3.63E-03 1.42E+01 1.42E+01 1.42E+01 4.09E-03 1.42E+01 1.42E+01 1.42E+01 4.15E-03 1.42E+01 1.42E+01 1.42E+01 4.44E-03 1.42E+01 1.42E+01 1.42E+01 4.34E-03 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 3.83E-03 3.83E-03 3.83E-03 4.60E-03 5.02E-03 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 108 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +15V RL=open (V) 1.44E+01 1.42E+01 1.40E+01 1.38E+01 1.36E+01 1.34E+01 1.32E+01 1.30E+01 1.28E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.52. Plot of Output Voltage High 2 @ +15V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 109 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.52. Raw data for Output Voltage High 2 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +15V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.42E+01 1.43E+01 20 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 1.43E+01 1.42E+01 1.43E+01 50 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 1.43E+01 1.43E+01 100 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 200 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.43E+01 1.42E+01 3.49E-03 1.43E+01 1.42E+01 1.42E+01 4.00E-03 1.43E+01 1.42E+01 1.42E+01 3.71E-03 1.43E+01 1.42E+01 1.42E+01 4.53E-03 1.43E+01 1.42E+01 1.42E+01 4.88E-03 1.42E+01 1.42E+01 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 3.63E-03 3.11E-03 3.77E-03 3.85E-03 4.42E-03 1.43E+01 1.43E+01 1.43E+01 1.43E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.42E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 110 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 1 @ +15V RL=2kΩ (V) 1.40E+01 1.20E+01 1.00E+01 8.00E+00 6.00E+00 4.00E+00 2.00E+00 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.53. Plot of Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 111 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.53. Raw data for Output Voltage High 1 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 1 @ +15V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01 1.29E+01 20 1.29E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01 1.29E+01 50 1.29E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 100 1.29E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 200 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01 1.29E+01 1.29E+01 1.29E+01 2.10E-02 1.29E+01 1.28E+01 1.28E+01 2.16E-02 1.29E+01 1.28E+01 1.28E+01 2.14E-02 1.29E+01 1.28E+01 1.28E+01 2.28E-02 1.29E+01 1.28E+01 1.28E+01 2.61E-02 1.29E+01 1.27E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01 3.50E-02 3.48E-02 3.54E-02 3.65E-02 3.65E-02 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.28E+01 1.28E+01 1.28E+01 1.28E+01 1.27E+01 1.10E+01 1.10E+01 1.10E+01 1.00E+01 1.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 112 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Output Voltage High 2 @ +15V RL=2kΩ (V) 1.40E+01 1.20E+01 1.00E+01 8.00E+00 6.00E+00 4.00E+00 2.00E+00 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.54. Plot of Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 113 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.54. Raw data for Output Voltage High 2 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage High 2 @ +15V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.30E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 20 1.30E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 50 1.30E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.30E+01 100 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.30E+01 1.30E+01 1.29E+01 1.29E+01 1.30E+01 200 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.30E+01 1.29E+01 1.88E-02 1.30E+01 1.29E+01 1.29E+01 1.98E-02 1.30E+01 1.29E+01 1.29E+01 1.98E-02 1.30E+01 1.29E+01 1.29E+01 2.07E-02 1.30E+01 1.28E+01 1.29E+01 2.32E-02 1.29E+01 1.28E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.29E+01 2.82E-02 2.84E-02 2.90E-02 2.97E-02 2.96E-02 1.31E+01 1.30E+01 1.30E+01 1.30E+01 1.30E+01 1.29E+01 1.29E+01 1.29E+01 1.29E+01 1.28E+01 1.10E+01 1.10E+01 1.10E+01 1.00E+01 1.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 114 Output Voltage Low 1 @ +15V RL=open (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -1.28E+01 -1.30E+01 -1.32E+01 -1.34E+01 -1.36E+01 -1.38E+01 -1.40E+01 -1.42E+01 -1.44E+01 -1.46E+01 -1.48E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.55. Plot of Output Voltage Low 1 @ +15V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 115 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.55. Raw data for Output Voltage Low 1 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +15V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 20 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 50 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 100 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 200 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 1.95E-03 -1.46E+01 -1.46E+01 -1.46E+01 1.64E-03 -1.46E+01 -1.46E+01 -1.46E+01 1.48E-03 -1.46E+01 -1.46E+01 -1.46E+01 1.52E-03 -1.46E+01 -1.46E+01 -1.46E+01 2.19E-03 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 3.11E-03 2.70E-03 2.92E-03 2.88E-03 2.07E-03 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 116 Output Voltage Low 2 @ +15V RL=open (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased -1.28E+01 -1.30E+01 -1.32E+01 -1.34E+01 -1.36E+01 -1.38E+01 -1.40E+01 -1.42E+01 -1.44E+01 -1.46E+01 -1.48E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.56. Plot of Output Voltage Low 2 @ +15V RL=open (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 117 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.56. Raw data for Output Voltage Low 2 @ +15V RL=open (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +15V RL=open (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 20 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 50 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 100 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 200 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 1.64E-03 -1.46E+01 -1.46E+01 -1.46E+01 1.73E-03 -1.46E+01 -1.46E+01 -1.46E+01 1.92E-03 -1.46E+01 -1.46E+01 -1.46E+01 2.28E-03 -1.46E+01 -1.46E+01 -1.46E+01 1.64E-03 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 4.32E-03 4.49E-03 3.78E-03 4.51E-03 4.10E-03 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.46E+01 -1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01 -1.30E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 118 Output Voltage Low 1 @ +15V RL=2kΩ (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 0.00E+00 -2.00E+00 -4.00E+00 -6.00E+00 -8.00E+00 -1.00E+01 -1.20E+01 -1.40E+01 -1.60E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.57. Plot of Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 119 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.57. Raw data for Output Voltage Low 1 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 1 @ +15V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 20 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 50 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 100 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 200 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 1.53E-02 -1.35E+01 -1.36E+01 -1.36E+01 1.51E-02 -1.35E+01 -1.36E+01 -1.36E+01 1.48E-02 -1.35E+01 -1.36E+01 -1.35E+01 1.43E-02 -1.35E+01 -1.36E+01 -1.35E+01 1.43E-02 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 3.94E-02 3.95E-02 3.95E-02 4.04E-02 3.93E-02 -1.35E+01 -1.35E+01 -1.35E+01 -1.34E+01 -1.34E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.36E+01 -1.10E+01 -1.10E+01 -1.10E+01 -1.00E+01 -1.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 120 Output Voltage Low 2 @ +15V RL=2kΩ (V) RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 0.00E+00 -2.00E+00 -4.00E+00 -6.00E+00 -8.00E+00 -1.00E+01 -1.20E+01 -1.40E+01 -1.60E+01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.58. Plot of Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 121 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.58. Raw data for Output Voltage Low 2 @ +15V RL=2kΩ (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Low 2 @ +15V RL=2kΩ (V) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.37E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 20 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 50 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 100 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 200 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 1.41E-02 -1.36E+01 -1.36E+01 -1.36E+01 1.38E-02 -1.36E+01 -1.36E+01 -1.36E+01 1.39E-02 -1.35E+01 -1.36E+01 -1.36E+01 1.36E-02 -1.35E+01 -1.36E+01 -1.35E+01 1.36E-02 -1.35E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 -1.36E+01 3.84E-02 3.82E-02 3.79E-02 3.85E-02 3.71E-02 -1.35E+01 -1.35E+01 -1.35E+01 -1.35E+01 -1.34E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.37E+01 -1.10E+01 -1.10E+01 -1.10E+01 -1.00E+01 -1.00E+01 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 122 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Positive Slew Rate 1 @ +15V (V/us) 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.59. Plot of Positive Slew Rate 1 @ +15V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 123 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.59. Raw data for Positive Slew Rate 1 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 1 @ +15V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 9.10E-02 1.03E-01 1.07E-01 1.00E-01 8.90E-02 9.90E-02 9.00E-02 1.12E-01 1.12E-01 9.00E-02 1.04E-01 9.90E-02 20 9.90E-02 7.40E-02 9.60E-02 9.60E-02 8.20E-02 8.20E-02 9.50E-02 1.06E-01 1.06E-01 8.20E-02 9.60E-02 9.10E-02 50 9.30E-02 9.30E-02 9.40E-02 9.20E-02 8.50E-02 7.80E-02 9.40E-02 1.02E-01 8.80E-02 9.10E-02 9.50E-02 9.60E-02 100 7.60E-02 8.10E-02 8.90E-02 7.30E-02 7.90E-02 7.60E-02 7.30E-02 9.00E-02 8.40E-02 6.90E-02 1.03E-01 9.80E-02 200 7.10E-02 6.30E-02 7.10E-02 6.10E-02 6.40E-02 5.30E-02 6.20E-02 6.50E-02 6.90E-02 6.00E-02 9.90E-02 9.90E-02 9.80E-02 7.75E-03 1.19E-01 7.68E-02 8.94E-02 1.09E-02 1.19E-01 5.96E-02 9.14E-02 3.65E-03 1.01E-01 8.14E-02 7.96E-02 6.07E-03 9.62E-02 6.30E-02 6.60E-02 4.69E-03 7.89E-02 5.31E-02 1.01E-01 9.42E-02 9.06E-02 7.84E-02 6.18E-02 1.10E-02 1.20E-02 8.76E-03 8.50E-03 5.97E-03 1.31E-01 1.27E-01 1.15E-01 1.02E-01 7.82E-02 7.03E-02 6.13E-02 6.66E-02 5.51E-02 4.54E-02 6.00E-02 5.00E-02 3.00E-02 1.00E-02 1.00E-02 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 124 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Positive Slew Rate 2 @ +15V (V/us) 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.60. Plot of Positive Slew Rate 2 @ +15V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 125 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.60. Raw data for Positive Slew Rate 2 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Slew Rate 2 @ +15V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.03E-01 1.03E-01 1.10E-01 1.01E-01 9.70E-02 9.60E-02 1.01E-01 1.12E-01 1.13E-01 9.20E-02 1.01E-01 9.50E-02 20 1.04E-01 9.70E-02 9.90E-02 9.50E-02 8.40E-02 9.30E-02 8.70E-02 1.09E-01 1.07E-01 9.40E-02 9.60E-02 9.90E-02 50 9.70E-02 9.50E-02 9.90E-02 8.60E-02 8.40E-02 8.30E-02 9.30E-02 1.01E-01 1.01E-01 8.30E-02 1.03E-01 9.90E-02 100 8.70E-02 8.40E-02 8.70E-02 7.00E-02 6.60E-02 7.70E-02 7.20E-02 7.70E-02 9.20E-02 7.90E-02 9.40E-02 8.20E-02 200 6.60E-02 7.00E-02 6.70E-02 6.40E-02 5.30E-02 5.20E-02 6.70E-02 6.40E-02 6.40E-02 5.50E-02 8.70E-02 1.01E-01 1.03E-01 4.71E-03 1.16E-01 8.99E-02 9.58E-02 7.40E-03 1.16E-01 7.55E-02 9.22E-02 6.76E-03 1.11E-01 7.37E-02 7.88E-02 1.00E-02 1.06E-01 5.13E-02 6.40E-02 6.52E-03 8.19E-02 4.61E-02 1.03E-01 9.80E-02 9.22E-02 7.94E-02 6.04E-02 9.42E-03 9.54E-03 9.01E-03 7.50E-03 6.50E-03 1.29E-01 1.24E-01 1.17E-01 1.00E-01 7.82E-02 7.70E-02 7.18E-02 6.75E-02 5.88E-02 4.26E-02 6.00E-02 5.00E-02 3.00E-02 1.00E-02 1.00E-02 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 126 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Slew Rate 1 @ +15V (V/us) 0.00E+00 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.61. Plot of Negative Slew Rate 1 @ +15V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 127 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.61. Raw data for Negative Slew Rate 1 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 1 @ +15V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -1.12E-01 -1.08E-01 -1.10E-01 -1.07E-01 -1.02E-01 -1.04E-01 -1.04E-01 -1.17E-01 -1.21E-01 -1.04E-01 -1.01E-01 -1.00E-01 20 -1.05E-01 -1.04E-01 -1.08E-01 -1.04E-01 -9.50E-02 -1.00E-01 -1.01E-01 -1.12E-01 -1.10E-01 -1.05E-01 -1.03E-01 -8.80E-02 50 -9.60E-02 -9.70E-02 -1.00E-01 -9.50E-02 -8.70E-02 -9.10E-02 -8.00E-02 -9.30E-02 -9.20E-02 -8.20E-02 -1.04E-01 -9.80E-02 100 -8.50E-02 -7.90E-02 -9.30E-02 -8.10E-02 -7.50E-02 -7.10E-02 -8.10E-02 -8.90E-02 -8.00E-02 -8.00E-02 -1.03E-01 -1.00E-01 200 -7.20E-02 -5.70E-02 -6.10E-02 -5.00E-02 -5.50E-02 -5.40E-02 -6.50E-02 -6.00E-02 -6.00E-02 -5.40E-02 -9.30E-02 -9.60E-02 -1.08E-01 3.77E-03 -9.75E-02 -1.18E-01 -1.03E-01 4.87E-03 -8.99E-02 -1.17E-01 -9.50E-02 4.85E-03 -8.17E-02 -1.08E-01 -8.26E-02 6.84E-03 -6.38E-02 -1.01E-01 -5.90E-02 8.28E-03 -3.63E-02 -8.17E-02 -1.10E-01 -1.06E-01 -8.76E-02 -8.02E-02 -5.86E-02 8.34E-03 5.32E-03 6.11E-03 6.38E-03 4.67E-03 -8.71E-02 -9.10E-02 -7.09E-02 -6.27E-02 -4.58E-02 -1.33E-01 -1.20E-01 -1.04E-01 -9.77E-02 -7.14E-02 -6.00E-02 -5.00E-02 -3.00E-02 -1.00E-02 -1.00E-02 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 128 RLAT Report 09-300 090901 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Slew Rate 2 @ +15V (V/us) 0.00E+00 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 0 20 40 60 80 100 120 140 160 180 Total Dose (krad(Si)) Figure 5.62. Plot of Negative Slew Rate 2 @ +15V (V/us) versus total dose. The data show significant change with radiation, however the parameter remains within specification even after application of the KTLs statistics. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 129 200 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table 5.62. Raw data for Negative Slew Rate 2 @ +15V (V/us) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Slew Rate 2 @ +15V (V/us) Device 408 409 410 411 412 413 414 415 418 419 420 421 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -1.06E-01 -8.30E-02 -1.10E-01 -1.07E-01 -1.00E-01 -1.03E-01 -1.11E-01 -1.00E-01 -1.17E-01 -1.03E-01 -1.05E-01 -1.03E-01 20 -1.08E-01 -1.05E-01 -1.09E-01 -1.05E-01 -9.80E-02 -1.01E-01 -1.06E-01 -1.07E-01 -1.16E-01 -1.05E-01 -1.03E-01 -9.70E-02 50 -1.02E-01 -9.90E-02 -1.07E-01 -9.70E-02 -9.20E-02 -9.30E-02 -8.80E-02 -1.10E-01 -1.07E-01 -9.50E-02 -1.05E-01 -1.02E-01 100 -9.10E-02 -7.80E-02 -7.60E-02 -7.90E-02 -8.20E-02 -6.90E-02 -8.10E-02 -9.90E-02 -9.20E-02 -7.80E-02 -1.06E-01 -8.40E-02 200 -6.10E-02 -5.80E-02 -6.60E-02 -4.80E-02 -6.00E-02 -4.50E-02 -6.40E-02 -6.60E-02 -6.30E-02 -5.40E-02 -1.05E-01 -1.01E-01 -1.01E-01 1.08E-02 -7.16E-02 -1.31E-01 -1.05E-01 4.30E-03 -9.32E-02 -1.17E-01 -9.94E-02 5.59E-03 -8.41E-02 -1.15E-01 -8.12E-02 5.89E-03 -6.50E-02 -9.74E-02 -5.86E-02 6.62E-03 -4.05E-02 -7.67E-02 -1.07E-01 -1.07E-01 -9.86E-02 -8.38E-02 -5.84E-02 7.01E-03 5.52E-03 9.45E-03 1.18E-02 8.79E-03 -8.76E-02 -9.19E-02 -7.27E-02 -5.14E-02 -3.43E-02 -1.26E-01 -1.22E-01 -1.25E-01 -1.16E-01 -8.25E-02 -6.00E-02 -5.00E-02 -3.00E-02 -1.00E-02 -1.00E-02 PASS PASS PASS PASS PASS An ISO 9001:2000 Certified Company 130 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary were presented in this report. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to determine the outcome of the testing: following the radiation exposure each parameter had to pass the specification value and the average value for the five-piece sample must pass the specification value when the KTL limits are applied. If these conditions were not both satisfied following the radiation exposure, then the lot would be logged as an RLAT failure. Based on these criteria, The RH1078MW operational amplifiers passed the RLAT to the maximum tested level of 200krad(Si) (for the ±15V supply conditions) and 100krad(Si) (for the +5V and 0V supply conditions) with all measured parameters remaining within specification, including after application of the KTL statistics. The following exception should be noted, the input offset voltage for the 5V supply condition was out of specification after application of the KTL statistics intermittently due to a combination of an aggressive specification value and relative large distribution within the sample population. The input offset voltage was within specification at the 100krad(Si) read point and exhibited very little degradation with total ionizing dose. An ISO 9001:2000 Certified Company 131 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of device-under-test to show part markings An ISO 9001:2000 Certified Company 132 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: TID Bias Connections Biased Samples: Pin 1 2 3 4 5 6 7 8 9 10 Function OUT A -INPUT A +INPUT A N/C VN/C +INPUT B -INPUT B OUT B V+ Connection / Bias To Pin 2 via 10kΩ Resistor To Pin 1 via 10kΩ Resistor To 8V via 10kΩ Resistor N/C To –15V using 0.1μF Decoupling N/C To 8V via 10kΩ Resistor To Pin 9 via 10kΩ Resistor To Pin 8 via 10kΩ Resistor To +15V using 0.1μF Decoupling Unbiased Samples: Pin 1 2 3 4 5 6 7 8 9 10 Function OUT A -INPUT A +INPUT A N/C VN/C +INPUT B -INPUT B OUT B V+ Connection / Bias GND GND GND GND GND GND GND GND GND GND An ISO 9001:2000 Certified Company 133 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”. Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY CORPORATION, Drawing Number: 05-08-5020 REV. K “MICROCIRCUIT, LINEAR, MFG RH1078M, MICROPOWER, DUAL, SINGLE SUPPLY, PRECISION OP AMP”. An ISO 9001:2000 Certified Company 134 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, operational amplifiers, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. Note that test numbers 19 and 20 are modified from the datasheet condition of VCM=100mV to VCM=0V. This is because the LTS2020 measurement circuit has an impedance of ~333kΩ, such that at 100mV it is effectively injecting ~300nA of current. This is enough to raise the measured VOL by ~1mV. In our estimation, modifying the test condition as specified, plus biasing the amp not being measured to have a VOUT of ~100mV to make sure it’s not saturated, reduces the current injected by the measurement circuit to ~30nA or less. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 135 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.1. Measured parameters and test conditions for the RH1078MW. TEST NUMBER TEST DESCRIPTION TEST CONDITIONS 1 Positive Supply Current (ICC2) V=+5V 2 Negative Supply Current (IEE2) V=+5V 3&4 Input Offset Voltage (VOS1 &VOS2) V=+5V 5&6 Input Offset Current (IOS1 & IOS2) V=+5V 7&8 + Input Bias Current (IB+1 & IB+2) V=+5V 9 & 10 - Input Bias Current (IB-1 & IB-2) V=+5V 11 & 12 13 & 14 15 & 16 17 & 18 Common Mode Rejection Ratio (CMRR1 & CMRR2) Power Supply Rejection Ratio (PSRR1 & PSRR2) Large Signal Voltage Gain (AVOL 1 &AVOL2) Large Signal Voltage Gain (AVOL3 &AVOL4) V=+5V, VCM = 0V to 3.5V V= 2.3V to 12V V=+5V, RL =Open V=+5V, RL =50kΩ 19 & 20 VOUT Low (VOUTLOW1 & VOUTLOW2) V=+5V, RL =Open, VCM = 0V* 21 & 22 VOUT Low (VOUTLOW3 & VOUTLOW4) V=+5V, RL =2kΩ 23 & 24 VOUT Low (VOUTLOW5 & VOUTLOW6) V=+5V, ISINK=100µA 25 & 26 VOUT High (VOUTHIGH1 & VOUTHIGH2) V=+5V, RL =Open 27 & 28 VOUT High (VOUTHIGH3 & VOUTHIGH4) V=+5V, RL =2kΩ 29 & 30 +SR (Slew Rate 1 and Slew Rate 2) V=+5V, AV=1 31 & 32 -SR (Slew Rate 3 and Slew Rate 4) V=+5V, AV=1 * This is non-datasheet condition, see above for explanation. An ISO 9001:2000 Certified Company 136 RLAT Report 09-300 090901 R1.0 33 Positive Supply Current (ICC2) V=±15V 34 Negative Supply Current (IEE2) V=±15V 35 & 36 Input Offset Voltage (VOS3 &VOS4) V=±15V 37 & 38 Input Offset Current (IOS3 & IOS4) V=±15V 39 & 40 + Input Bias Current (IB+3 & IB+4) V=±15V 41 & 42 - Input Bias Current (IB-3 & IB-4) V=±15V 43 & 44 45 & 46 47 & 48 49 & 50 Common Mode Rejection Ratio (CMRR3 & CMRR4) Power Supply Rejection Ratio (PSRR3 & PSRR4) Large Signal Voltage Gain (AVOL 5 &AVOL6) Large Signal Voltage Gain (AVOL 7 &AVOL8) V=±15V, VCM = 13.5V, –15V V= 5V, 0V to ±18V V=±15V, RL=50kΩ V=±15V, RL=2kΩ 51 & 52 VOUT High (VOUTHIGH5 & VOUTHIGH6) V=±15V, RL=50kΩ 53 & 54 VOUT High (VOUTHIGH7 & VOUTHIGH8) V=±15V, RL=2kΩ 55 & 56 VOUT Low (VOUTLOW7 & VOUTLOW8) V=±15V, RL=50kΩ 57 & 58 VOUT Low (VOUTLOW9 & VOUTLOW10) V=±15V, RL=2kΩ 59 & 60 +SR (Slew Rate 5 and Slew Rate 6) V=±15V, AV=1 60 & 61 -SR (Slew Rate 7 and Slew Rate 8) V=±15V, AV=1 An ISO 9001:2000 Certified Company 137 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution for the RH1078MW. Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC) 1.5E-04A ± 1.31E-06A Negative Supply Current (IEE) -1.5E-04A ± 1.07E-06A Input Offset Voltage (VOS1 &VOS2) ±1.2E-04V ± 3.41E-06V Input Offset Current (IOS1 & IOS2) ±8E-10A ± 5.06E-11A + Input Bias Current (IB+1 & IB+2) ±1.5E-08A ± 5.88E-11A - Input Bias Current (IB-1 & IB-2) ±1.5E-08A ± 8.03E-11A 94dB ± 3.12E+00 dB 100dB ± 5.70E+00dB 150V/mV ± 2.69E+02V/mV 120V/mV ± 7.13E+02 V/mV VOUT Low (VOUTLOW1 & VOUTLOW2) 6E-03V ± 1.16E-04V VOUT Low (VOUTLOW3 & VOUTLOW4) 2E-03V ± 3.43E-05V VOUT Low (VOUTLOW5 & VOUTLOW6) 1.3E-01V ± 3.22E-04V VOUT High (VOUTHIGH1 & VOUTHIGH2) 4.2V ± 3.11E-03V VOUT High (VOUTHIGH3 & VOUTHIGH4) 3.5V ± 2.13E-03V +SR (Slew Rate 1 and Slew Rate 2) 4E-02V/μs ± 1.07E-03V/μs -SR (Slew Rate 3 and Slew Rate 4) -4E-02V/μs ± 1.81E-03 V/μs Measured Parameter Common Mode Rejection Ratio (CMRR1 & CMRR2) Power Supply Rejection Ratio (PSRR1 & PSRR2) Large Signal Voltage Gain (AVOL 1 &AVOL2) Large Signal Voltage Gain (AVOL3 &AVOL4) An ISO 9001:2000 Certified Company 138 RLAT Report 09-300 090901 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Pre-Irradiation Specification Measurement Resolution/Precision Positive Supply Current (ICC2) 2E-04A ± 1.74E-06A Negative Supply Current (IEE2) -2E-04A ± 9.73E-07A Input Offset Voltage (VOS3 &VOS4) ±3.5E-4V ± 2.51E-06V Input Offset Current (IOS3 & IOS4) ±8E-10A ± 3.54E-11A + Input Bias Current (IB+3 & IB+4) ±1.5E-08A ± 3.89E-11A - Input Bias Current (IB-3 & IB-4) ±1.5E-08A ± 7.51E-11A 97dB ± 2.98E-01dB 100dB ± 4.20E+00dB 1000V/mV ± 2.34E+04V/mV 300V/mV ± 7.07E+01V/mV VOUT High (VOUTHIGH5 & VOUTHIGH6) 13V ± 2.38E-03V VOUT High (VOUTHIGH7 & VOUTHIGH8) 11V ± 1.17E-03V VOUT Low (VOUTLOW7 & VOUTLOW8) -13V ± 1.75E-03V VOUT Low (VOUTLOW9 & VOUTLOW10) -11V ± 4.14E-03V +SR (Slew Rate 5 and Slew Rate 6) 6E-02V/μs ± 6.97E-03V/μs -SR (Slew Rate 7 and Slew Rate 8) -6E-02V/μs ± 9.02E-03V/μs Measured Parameter Common Mode Rejection Ratio (CMRR3 & CMRR4) Power Supply Rejection Ratio (PSRR3 & PSRR4) Large Signal Voltage Gain (AVOL 5 &AVOL6) Large Signal Voltage Gain (AVOL 7 &AVOL8) An ISO 9001:2000 Certified Company 139 RLAT Report 09-300 090901 R1.0 Appendix D: List of Figures Used in Section 5 (RLAT Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current @ +5V (A) Negative Supply Current @ +5V (A) Input Offset Voltage 1 @ +5V (V) Input Offset Voltage 2 @ +5V (V) Input Offset Current 1 @ +5V (A) Input Offset Current 2 @ +5V (A) Positive Input Bias Current 1 @ +5V (A) Positive Input Bias Current 2 @ +5V (A) Negative Input Bias Current 1 @ +5V (A) Negative Input Bias Current 2 @+5V (A) Common Mode Rejection Ratio 1 @ +5V (dB) Common Mode Rejection Ratio 2 @ +5V (dB) Power Supply Rejection Ratio 1 @ +5V (dB) Power Supply Rejection Ratio 2 @ +5V (dB) Open Loop Gain 1 @ +5V, RL=open (V/mV) Open Loop Gain 2 @ +5V, RL=open (V/mV) Open Loop Gain 1 @ +5V, RL=50kΩ (V/mV) Open Loop Gain 2 @ +5V, RL=50kΩ (V/mV) Output Voltage Low 1 @ +5V RL=open (V) Output Voltage Low 2 @ +5V RL=open (V) Output Voltage Low 1 @ +5V RL=2kΩ (V) Output Voltage Low 2 @ +5V RL=2kΩ (V) Output Voltage Low 1 @ +5V IL=100uA (V) Output Voltage Low 2 @ +5V IL=100uA (V) Output Voltage High 1 @ +5V RL=open (V) Output Voltage High 2 @ +5V RL=open (V) Output Voltage High 1 @ +5V RL=2kΩ (V) Output Voltage High 2 @ +5V RL=2kΩ (V) Positive Slew Rate 1 @ +5V (V/us) Positive Slew Rate 2 @ +5V (V/us) Negative Slew Rate 1 @ +5V (V/us) Negative Slew Rate 2 @ +5V (V/us) Positive Supply Current @ +15V (A) Negative Supply Current @ +15V (A) Input Offset Voltage 1 @ +15V (V) Input Offset Voltage 2 @ +15V (V) Input Offset Current 1 @ +15V (A) Input Offset Current 2 @ +15V (A) Positive Input Bias Current 1 @ +15V (A) An ISO 9001:2000 Certified Company 140 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 09-300 090901 R1.0 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 Positive Input Bias Current 2 @ +15V (A) Negative Input Bias Current 1 @ +15V (A) Negative Input Bias Current 2 @ +15V (A) Common Mode Rejection Ratio 1 @ +15V (dB) Common Mode Rejection Ratio 2 @ +15V (dB) Power Supply Rejection Ratio 1 @ +15V (dB) Power Supply Rejection Ratio 2 @ +15V (dB) Open Loop Gain 1 @ +15V, RL=50kΩ (V/mV) Open Loop Gain 2 @ +15V, RL=50kΩ (V/mV) Open Loop Gain 1 @ +15V, RL=2kΩ (V/mV) Open Loop Gain 2 @ +15V, RL=2kΩ (V/mV) Output Voltage High 1 @ +15V RL=open (V) Output Voltage High 2 @ +15V RL=open (V) Output Voltage High 1 @ +15V RL=2kΩ (V) Output Voltage High 2 @ +15V RL=2kΩ (V) Output Voltage Low 1 @ +15V RL=open (V) Output Voltage Low 2 @ +15V RL=open (V) Output Voltage Low 1 @ +15V RL=2kΩ (V) Output Voltage Low 2 @ +15V RL=2kΩ (V) Positive Slew Rate 1 @ +15V (V/us) Positive Slew Rate 2 @ +15V (V/us) Negative Slew Rate 1 @ +15V (V/us) Negative Slew Rate 2 @ +15V (V/us) An ISO 9001:2000 Certified Company 141 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800