ELDRS_LDR_RH1021BMH-10_Fab_Lot_1245822.1_W1.pdf

TID LDR RH1021BMH-10 1245822 W1
Total Ionization Dose (TID) Test Results of the
RH1021BMH-10 Precision 10V Reference @ Low Dose
Rate (LDR)
LDR = 10 mrads(Si)/s
22 September 2014
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the Product Engineering and Applications Signal Group
from Linear Technology for their help with the board design and assembly as well as the
data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd
from Defense Microelectronics Activity (DMEA) for the extensive work for board setup
and continuous dosimetry monitoring throughout the ELDRS tests.
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LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
TID LDR Testing of the RH1021BMH-10 Precision 10V
Reference
Part Type Tested: RH1021-10 Precision 10V Reference
Traceability Information: Fab Lot# 1245822.1; Wafer # 1; Assembly Lot # 724755.1; Date
Code: 1332A. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5
units for unbiased irradiation. Serial numbers 145 to 149 had all pins tied to ground during
irradiation. Serial numbers 150 to 154 were biased during irradiation. Serial numbers 199 and
200 were used as control. See Appendix B for the radiation bias connection tables.
Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test
increments: pre-irradiation, 10 Krads(Si), 22 Krads(Si), 50 Krads(Si), 100 Krads(Si).
Radiation dose: 10 mrads(Si)/sec.
Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D.
Test Hardware and Software: LTX pre-irradiation test program ERHB102110.01; LTX postirradiation test program ERHB102110.01; Test Board LT1021; Test Setup 04-04-0540.
Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750.
SUMMARY
ALL 10 PARTS PASSED THE ELECTRICAL TEST LIMITS AS
SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION
INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER
REQUEST.
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TID LDR RH1021BMH-10 1245822 W1
1.0
Overview and Background
Among other radiation effects, Total Ionizing Dose (TID) may affect circuits’ electrical
characteristics, causing parametric and/or functional failures in integrated circuits. During
gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge
trapping in the transistors’ dielectrics and interface regions, affecting hence the devices’ basic
features. Such effects warrant testing and monitoring of circuits to TID, after which annealing
and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and
process technology. Hence is the requirement per Condition D (for low-dose rates ranging from
less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 to not exceed the allowed time
from the end of an incremented irradiation and an electrical test to more than one hour.
Additionally, the total time from the end of one incremental irradiation to the start of the next
incremental step should be less than two hours.
2.0
Radiation facility and test equipment
The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in
Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate
of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel
positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain
optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry.
3.0
Test Conditions
The 10 test samples and two control units were electrically tested at 25°C prior to irradiation.
The parts were then placed in a lead/aluminum container and aligned with the radiation source,
Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased
at +/- 15V and other five had all pads grounded. The devices were irradiated up to 100 Krad(Si)
with increments of 10, 20, and 50 Krads(Si). After each irradiation the samples were transported
in dry ice to Linear Technology testing facility. Testing was performed on the two control units to
confirm the operation of the test system prior to the electrical testing of the 12 units (10
irradiated and 2 control).
The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias
must pass the datasheet limits. If any of the measured parameters of these five units do not
meet the required limits then a failure-analysis of the part should be conducted and if valid the
lot will be scrapped.
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TID LDR RH1021BMH-10 1245822 W1
4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations:
-
Output Voltage (V)
Output Voltage Temperature Coefficient (ppm/°C)
Line Regulation with condition 7.2V ≤ VIN ≤ 10V (ppm/V)
Line Regulation with condition 710V ≤ VIN ≤ 40V (ppm/V)
Load Regulation (Sourcing Current) (ppm/mA)
Load Regulation (Sinking Current) (ppm/mA)
Supply Current (Series Mode) (mA)
Minimum Supply Current (Shunt Mode) (µA)
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
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TID LDR RH1021BMH-10 1245822 W1
5.0
Test Results
All ten samples passed the post-irradiation electrical tests. All measurements of the eight listed
parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can
be calculated by adding to and subtracting from mean the product of standard deviation and the
tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability
distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
However, in most cases, mean and standard deviation are unknown and therefore it is practical
to estimate both of them from a sample. Hence the tolerance limit depends greatly on the
sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a
sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B).
The KTL factor in this report is 2.742.
In the plots, the dotted lines with diamond markers are the average of the measured data points
of five samples irradiated under electrical bias while the dashed lines with X-markers are the
average of measured data points of five units irradiated with all pins tied to ground. The solid
lines with triangle markers are the average of the data points after the calculation of the KTL
statistics on the sample irradiated in the biased setup. The solid lines with square symbols are
the average of the measured points after the application of the KTL statistics on the five samples
irradiated with all pins grounded. The orange solid lines with circle markers are the specification
limits.
The 22 Krads(Si) test limits are using Linear Technology datasheet 20 Krads(Si) specification
limits.
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TID LDR RH1021BMH-10 1245822 W1
10.0800
10.0600
Specification MAX
10.0400
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (+KTL) Biased
Vout (V)
10.0200
Average All GND'd
10.0000
Average Biased
9.9800
Ps90%/90% (-KTL) All GND'd
9.9600
Ps90%/90% (-KTL) Biased
9.9400
Specification MIN
9.9200
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.1 Plot of Output Voltage versus Total Dose
The post-irradiation measured values are within specification datasheet limits.
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TID LDR RH1021BMH-10 1245822 W1
Table 5.1: Raw data for Output Voltage (V) versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL) under the orange headers)
Parameter
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
VOUT
Unit #
(V)
0
10
22
50
100
145
All GND'd Irradiation
10.0192 10.0193 10.0206 10.0200 10.0193
146
All GND'd Irradiation
10.0126 10.0129 10.0146 10.0136 10.0134
147
All GND'd Irradiation
10.0169 10.0171 10.0185 10.0175 10.0170
148
All GND'd Irradiation
10.0055 10.0058 10.0075 10.0068 10.0067
149
All GND'd Irradiation
10.0088 10.0093 10.0107 10.0100 10.0099
150
Biased Irradiation
10.0163 10.0141 10.0140 10.0120 10.0093
151
Biased Irradiation
10.0114 10.0096 10.0096 10.0077 10.0056
152
Biased Irradiation
10.0066 10.0046 10.0048 10.0030 10.0008
153
Biased Irradiation
10.0143 10.0121 10.0120 10.0103 10.0079
154
Biased Irradiation
10.0166 10.0145 10.0146 10.0128 10.0104
199
Control Unit
10.0081 10.0078 10.0088 10.0081 10.0077
200
Control Unit
10.0129 10.0124 10.0134 10.0128 10.0124
All GND'd Irradiation Statistics
Average All GND'd
10.0126 10.0129 10.0144 10.0136 10.0133
Std Dev All GND'd
0.0056
0.0055
0.0054
0.0054
0.0051
Ps90%/90% (+KTL) All GND'd
10.0280 10.0280 10.0292 10.0283 10.0273
Ps90%/90% (-KTL) All GND'd
9.9972
9.9977
9.9996
9.9988
9.9992
Biased Irradiation Statistics
Average Biased
10.0130 10.0110 10.0110 10.0091 10.0068
Std Dev Biased
0.0042
0.0041
0.0040
0.0039
0.0038
Ps90%/90% (+KTL) Biased
10.0245 10.0221 10.0219 10.0200 10.0173
Ps90%/90% (-KTL) Biased
10.0016
9.9999
10.0001
9.9983
9.9963
Specification MIN
9.95
9.95
9.945
9.942
9.938
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Specification MAX
10.05
10.05
10.055
10.06
10.06
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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8.00
Specification MAX
6.00
Ps90%/90% (+KTL) Biased
TCVOUT (ppm/°C)
4.00
Ps90%/90% (+KTL) All GND'd
2.00
Average Biased
0.00
Average All GND'd
-2.00
Ps90%/90% (-KTL) All GND'd
-4.00
Ps90%/90% (-KTL) Biased
-6.00
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.2: Plot of Output Voltage Temperature Coefficient versus Total Dose
The measured values of 10 samples are under datasheet maximum limits.
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TID LDR RH1021BMH-10 1245822 W1
Table 5.2: Raw data for voltage output temperature coefficient (ppm/°C) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL under the second orange header)
Parameter
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
TCVOUT
Unit #
(ppm/°C)
0
10
22
50
100
145
All GND'd Irradiation
0.3881
-0.0770 -1.2355 -1.1600 -1.6247
146
All GND'd Irradiation
-0.9957 -0.4406 -1.6485 -1.3777 -2.0438
147
All GND'd Irradiation
-1.1644 -0.6181 -1.8973 -2.5111 -3.4232
148
All GND'd Irradiation
-1.6671 -0.5600 -1.3661 -1.5108 -2.5335
149
All GND'd Irradiation
-0.1604 -0.0394 -1.0380 -0.5861 -1.5803
150
Biased Irradiation
0.7824
1.9343
0.2886
0.9500
0.3057
151
Biased Irradiation
-1.7956 -0.5325 -1.1580 -1.1573 -2.1015
152
Biased Irradiation
-0.6651 -0.3606 -0.8895 -1.7197 -1.6474
153
Biased Irradiation
1.4027
2.6584
0.8966
0.8847
0.7848
154
Biased Irradiation
-1.6466 -0.4440 -0.7745 -2.0780 -2.6373
199
Control Unit
-2.0499 -1.0789 -1.4922 -1.5279 -0.5758
200
Control Unit
-1.5130
0.3365
-0.5778
0.8164
1.1075
All GND'd Irradiation Statistics
Average All GND'd
-0.7199 -0.3470 -1.4371 -1.4291 -2.2411
Std Dev All GND'd
0.8233
0.2716
0.3397
0.7005
0.7646
Ps90%/90% (+KTL) All GND'd
1.5377
0.3978
-0.5057
0.4917
-0.1446
Ps90%/90% (-KTL) All GND'd
-2.9775 -1.0918 -2.3685 -3.3500 -4.3376
Biased Irradiation Statistics
Average Biased
-0.3844
0.6511
-0.3274 -0.6241 -1.0591
Std Dev Biased
1.4334
1.5247
0.8780
1.4450
1.5154
Ps90%/90% (+KTL) Biased
3.5459
4.8320
2.0800
3.3382
3.0962
Ps90%/90% (-KTL) Biased
-4.3148 -3.5297 -2.7348 -4.5863 -5.2145
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
5
5
5
5
7
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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TID LDR RH1021BMH-10 1245822 W1
ΔVOUT/ΔVIN (ppm/V) (11.5V ≤ VIN ≤= 14.5V)
6.00
Specification MAX
5.00
Ps90%/90% (+KTL) All GND'd
4.00
Ps90%/90% (+KTL) Biased
3.00
Average All GND'd
2.00
Average Biased
1.00
Ps90%/90% (-KTL) Biased
0.00
Ps90%/90% (-KTL) All GND'd
-1.00
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.3: Plot of Line Regulation (11.5V ≤ VIN ≤ 14.5V) versus Total Dose
All measured data points are lower than the datasheet specification maximum.
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TID LDR RH1021BMH-10 1245822 W1
Table 5.3: Raw data for line regulation (ppm/V) with 11.5V ≤ VIN ≤ 14.5V versus total dose
including the statistical calculations, minimum specification, maximum specification, and the
status of the test (PASS/FAIL).
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
Parameter ΔVOUT/ΔVIN (11.5V≤VIN≤14.5V)
Unit #
(ppm/V)
0
10
22
50
100
145
All GND'd Irradiation
-0.0037 2.57E-07 0.0120
-0.0258 -0.0060
146
All GND'd Irradiation
0.0024 7.26E-06 -0.0350 -0.0163 -0.0135
147
All GND'd Irradiation
-0.0142 -1.34E-05 -0.0434 -0.0399
0.0002
148
All GND'd Irradiation
-0.0093 -1.89E-05 0.0098
-0.0047 -0.0102
149
All GND'd Irradiation
-0.0014 -4.48E-06 -0.0195
0.0245
-0.0023
150
Biased Irradiation
-0.0056 -6.78E-06 -0.0189 -0.0279 -0.0029
151
Biased Irradiation
-0.0067 -3.71E-06 -0.0173 -0.0065 -0.0150
152
Biased Irradiation
-0.0080 -2.39E-05 -0.0140 -0.0215 -0.0121
153
Biased Irradiation
0.0061 1.62E-07 -0.0386 -0.0108 -0.0128
154
Biased Irradiation
-0.0139 -1.22E-05 -0.0070 -0.0305 -0.0004
199
Control Unit
-0.0032 -3.40E-06 -0.0170 -0.0395 -0.0022
200
Control Unit
-0.0004 -7.75E-06 -0.0366
0.0393
-0.0071
All GND'd Irradiation Statistics
Average All GND'd
-0.0053 -5.85E-06 -0.0152 -0.0125 -0.0064
Std Dev All GND'd
0.0066 1.05E-05 0.0253
0.0243
0.0056
Ps90%/90% (+KTL) All GND'd
0.0128 2.28E-05 0.0543
0.0543
0.0089
Ps90%/90% (-KTL) All GND'd
-0.0233 -3.46E-05 -0.0847 -0.0792 -0.0217
Biased Irradiation Statistics
Average Biased
-0.0056 -9.28E-06 -0.0192 -0.0194 -0.0086
Std Dev Biased
0.0073 9.33E-06 0.0118
0.0105
0.0065
Ps90%/90% (+KTL) Biased
0.0144 1.63E-05 0.0131
0.0094
0.0093
Ps90%/90% (-KTL) Biased
-0.0256 -3.49E-05 -0.0515 -0.0482 -0.0266
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
4
4
4
4.5
5
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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TID LDR RH1021BMH-10 1245822 W1
∆VOUT/∆VIN (ppm/V) (14.5V ≤ VIN ≤ 40V)
2.50
Specification MAX
2.00
Ps90%/90% (+KTL) All GND'd
1.50
Ps90%/90% (+KTL) Biased
1.00
Average All GND'd
Average Biased
0.50
Ps90%/90% (-KTL) Biased
0.00
Ps90%/90% (-KTL) All GND'd
-0.50
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.4: Plot of Line Regulation (14.5V ≤ VIN ≤ 40V) versus Total Dose
All measured data points are well under datasheet upper limits.
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Table 5.4: Raw data for line regulation (ppm/V) with 14.5V ≤ VIN ≤ 40V versus total dose
including the statistical calculations, minimum specification, maximum specification, and the
status of the test (PASS/FAIL).
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
Parameter ∆VOUT/∆VIN (14.5V ≤ VIN ≤ 40V)
Unit #
(ppm/V)
0
10
22
50
100
145
All GND'd Irradiation
-0.0302 -0.0377 -0.0551
0.0021
-0.0294
146
All GND'd Irradiation
-0.0273 -0.0528 -0.0182 -0.0390 -0.0469
147
All GND'd Irradiation
-0.0273 -0.0327 -0.0278 -0.0021 -0.0505
148
All GND'd Irradiation
-0.0339 -0.0387 -0.0440 -0.0456 -0.0474
149
All GND'd Irradiation
-0.0124 -0.0303 -0.0092 -0.0554 -0.0313
150
Biased Irradiation
-0.0271 -0.0437 -0.0448 -0.0126 -0.0379
151
Biased Irradiation
-0.0280 -0.0264 -0.0153 -0.0312 -0.0419
152
Biased Irradiation
-0.0385 -0.0324 -0.0272 -0.0478 -0.0425
153
Biased Irradiation
-0.0268 -0.0313 -0.0092 -0.0434 -0.0266
154
Biased Irradiation
-0.0267 -0.0351 -0.0428 -0.0212 -0.0395
199
Control Unit
-0.0305 -0.0394 -0.0433
0.0062
-0.0446
200
Control Unit
-0.0090 -0.0297 -0.0074 -0.0705 -0.0187
All GND'd Irradiation Statistics
Average All GND'd
-0.0262 -0.0385 -0.0309 -0.0280 -0.0411
Std Dev All GND'd
0.0082
0.0087
0.0187
0.0263
0.0100
Ps90%/90% (+KTL) All GND'd
-0.0038 -0.0145
0.0204
0.0440
-0.0138
Ps90%/90% (-KTL) All GND'd
-0.0487 -0.0624 -0.0821 -0.1000 -0.0684
Biased Irradiation Statistics
Average Biased
-0.0294 -0.0338 -0.0279 -0.0312 -0.0377
Std Dev Biased
0.0051
0.0064
0.0159
0.0147
0.0064
Ps90%/90% (+KTL) Biased
-0.0154 -0.0162
0.0158
0.0092
-0.0200
Ps90%/90% (-KTL) Biased
-0.0435 -0.0513 -0.0716 -0.0716 -0.0554
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
2
2
2
2
2
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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30
Specification MAX
∆VOUT/∆IOUT (ppm/mA)
(Source 0≤ IOUT ≤10mA)
25
Ps90%/90% (+KTL) All GND'd
20
Ps90%/90% (+KTL) Biased
15
Average All GND'd
10
Average Biased
5
Ps90%/90% (-KTL) Biased
0
Ps90%/90% (-KTL) All GND'd
-5
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.5: Plot of Load Regulation (Sourcing 0 ≤ IOUT ≤ 10mA) versus Total Dose
The measured parameters are well under the specification maximum limits.
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Table 5.5: Raw data for load regulation sourcing (ppm/mA) with 0 ≤ IOUT ≤ 10mA versus total
dose including the statistical calculations, minimum specification, maximum specification, and
the status of the test (PASS/FAIL)
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
Parameter ∆VO/∆IO (Source 0≤ IOUT ≤10mA)
Unit #
(ppm/mA)
0
10
22
50
100
145
All GND'd Irradiation
-1.1019 -1.1117 -0.9086 -1.1749 -1.1769
146
All GND'd Irradiation
-1.0807 -1.1302 -0.8722 -1.1816 -1.1306
147
All GND'd Irradiation
-1.1235 -1.1694 -0.9895 -1.1856 -1.1772
148
All GND'd Irradiation
-1.1547 -1.1238 -0.9578 -1.2230 -1.1820
149
All GND'd Irradiation
-1.3616 -1.1001 -0.9308 -1.1914 -1.1712
150
Biased Irradiation
-1.0262 -1.1207 -0.9299 -1.1269 -1.1470
151
Biased Irradiation
-1.1050 -1.1240 -1.0597 -1.1488 -1.1438
152
Biased Irradiation
-1.0560 -1.1409 -1.0356 -1.1650 -1.1507
153
Biased Irradiation
-1.1102 -1.1647 -1.0375 -1.1763 -1.2130
154
Biased Irradiation
-1.0749 -1.1359 -1.0852 -1.1618 -1.1919
199
Control Unit
-1.0618 -1.0524 -0.9615 -1.1569 -1.1873
200
Control Unit
-1.0640 -1.0213 -0.8796 -1.1269 -1.1304
All GND'd Irradiation Statistics
Average All GND'd
-1.1645 -1.1270 -0.9318 -1.1913 -1.1676
Std Dev All GND'd
0.1135
0.0263
0.0450
0.0187
0.0210
Ps90%/90% (+KTL) All GND'd
-0.8532 -1.0548 -0.8084 -1.1400 -1.1099
Ps90%/90% (-KTL) All GND'd
-1.4758 -1.1992 -1.0551 -1.2426 -1.2253
Biased Irradiation Statistics
Average Biased
-1.0744 -1.1372 -1.0296 -1.1557 -1.1693
Std Dev Biased
0.0349
0.0175
0.0592
0.0189
0.0313
Ps90%/90% (+KTL) Biased
-0.9786 -1.0894 -0.8672 -1.1040 -1.0835
Ps90%/90% (-KTL) Biased
-1.1702 -1.1851 -1.1920 -1.2074 -1.2551
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
25
25
25
25
25
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 15 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
120
∆VOUT/∆IOUT (ppm/mA)
(Shunt 1.7mA ≤ IOUT ≤ 10mA)
100
Specification MAX
Ps90%/90% (+KTL) All GND'd
80
Ps90%/90% (+KTL) Biased
60
Average All GND'd
40
Average Biased
20
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) All GND'd
0
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.6: Plot of Load Regulation (Shunting 1.7mA ≤ IOUT ≤ 10mA) versus Total Dose
The maximum limits at different post-irradiation doses of the parameter are at 100 ppm/mA and
the measured values are in the 2 ppm/mA range.
P a g e 16 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Table 5.6: Raw data for load regulation shunting (ppm/mA) with 1.7mA ≤ IOUT ≤ 10mA versus
total dose including the statistical calculations, minimum specification, maximum specification,
and the status of the test (PASS/FAIL)
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
Parameter ∆VO/∆IO(Shunt 1.7mA≤IO≤10mA)
Unit #
(ppm/mA)
0
10
22
50
100
145
All GND'd Irradiation
2.2634
2.2069
1.2043
2.8792
1.9767
146
All GND'd Irradiation
1.5021
2.1301
1.3572
2.1925
2.1302
147
All GND'd Irradiation
3.0248
2.2069
1.5867
2.1925
2.2070
148
All GND'd Irradiation
2.4918
1.6697
2.5810
2.2688
2.6674
149
All GND'd Irradiation
1.9589
1.5929
2.1986
2.2688
1.9767
150
Biased Irradiation
2.7964
2.2069
1.8927
2.4214
2.8977
151
Biased Irradiation
2.3395
1.5162
1.8162
2.1925
1.6697
152
Biased Irradiation
2.1873
1.9767
1.5867
2.1925
1.9000
153
Biased Irradiation
2.1873
2.0534
2.1221
2.1925
2.2837
154
Biased Irradiation
2.6441
1.9767
1.6632
2.1925
2.2070
199
Control Unit
1.5021
1.9767
1.8927
2.1925
2.8209
200
Control Unit
2.0350
1.6697
2.1986
2.5740
1.9000
All GND'd Irradiation Statistics
Average All GND'd
2.2482
1.9613
1.7856
2.3604
2.1916
Std Dev All GND'd
0.5707
0.3041
0.5840
0.2925
0.2841
Ps90%/90% (+KTL) All GND'd
3.8132
2.7951
3.3869
3.1625
2.9705
Ps90%/90% (-KTL) All GND'd
0.6832
1.1275
0.1842
1.5583
1.4127
Biased Irradiation Statistics
Average Biased
2.4309
1.9460
1.8162
2.2383
2.1916
Std Dev Biased
0.2766
0.2580
0.2095
0.1024
0.4649
Ps90%/90% (+KTL) Biased
3.1894
2.6534
2.3905
2.5190
3.4665
Ps90%/90% (-KTL) Biased
1.6724
1.2385
1.2418
1.9576
0.9167
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
100
100
100
100
100
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 17 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Supply Current (mA)
1.80
1.70
Specification MAX
1.60
Ps90%/90% (+KTL) All GND'd
1.50
Ps90%/90% (+KTL) Biased
1.40
Average All GND'd
1.30
Average Biased
1.20
Ps90%/90% (-KTL) Biased
1.10
Ps90%/90% (-KTL) All GND'd
1.00
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.7: Plot of Supply Current versus Total Dose
The average measured values of 10 samples are within datasheet maximum limits.
P a g e 18 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Table 5.7: Raw data table for supply current (mA) versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL)
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
Parameter
IS
Unit #
(mA)
0
10
22
50
100
145
All GND'd Irradiation
1.1063
1.1234
1.2255
1.0984
1.0713
146
All GND'd Irradiation
1.1058
1.1258
1.2435
1.1056
1.1068
147
All GND'd Irradiation
1.1127
1.1322
1.2029
1.1112
1.1117
148
All GND'd Irradiation
1.1046
1.1188
1.2135
1.1035
1.1087
149
All GND'd Irradiation
1.1243
1.1418
1.2270
1.1213
1.1262
150
Biased Irradiation
1.0802
1.0932
1.1501
1.0774
1.0776
151
Biased Irradiation
1.1012
1.1427
1.1345
1.1169
1.1195
152
Biased Irradiation
1.1163
1.1297
1.1671
1.1130
1.1060
153
Biased Irradiation
1.1014
1.1141
1.1602
1.1038
1.1009
154
Biased Irradiation
1.1184
1.1201
1.1186
1.1138
1.0999
199
Control Unit
1.1191
1.1418
1.1759
1.1258
1.1209
200
Control Unit
1.1323
1.1382
1.2599
1.1439
1.1435
All GND'd Irradiation Statistics
Average All GND'd
1.1108
1.1284
1.2225
1.1080
1.1049
Std Dev All GND'd
0.0082
0.0089
0.0153
0.0087
0.0203
Ps90%/90% (+KTL) All GND'd
1.1333
1.1528
1.2644
1.1319
1.1605
Ps90%/90% (-KTL) All GND'd
1.0883
1.1040
1.1805
1.0841
1.0493
Biased Irradiation Statistics
Average Biased
1.1035
1.1200
1.1461
1.1050
1.1008
Std Dev Biased
0.0153
0.0185
0.0196
0.0162
0.0152
Ps90%/90% (+KTL) Biased
1.1454
1.1706
1.2000
1.1493
1.1423
Ps90%/90% (-KTL) Biased
1.0616
1.0693
1.0922
1.0606
1.0592
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
1.7
1.7
1.7
1.7
1.7
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 19 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Minimum Supply Current (uA)
1600
1500
Specification MAX
1400
Ps90%/90% (+KTL) All
GND'd
1300
Ps90%/90% (+KTL) Biased
1200
Average All GND'd
1100
Average Biased
1000
Ps90%/90% (-KTL) Biased
900
Ps90%/90% (-KTL) All
GND'd
800
700
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.8: Plot of Minimum Supply Current versus Total Dose
The average measured values of 10 samples are within datasheet maximum limits.
P a g e 20 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Table 5.8: Raw data table for supply current (mA) versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL)
Total Dose (Krad(Si)) @ 10 mrads(Si)/s
Parameter
Imin
Unit #
(uA)
0
10
22
50
100
145
All GND'd Irradiation
853.14
864.07
948.34
852.07
848.63
146
All GND'd Irradiation
847.16
865.94
954.51
858.55
868.04
147
All GND'd Irradiation
862.59
882.99
935.10
870.89
883.50
148
All GND'd Irradiation
845.67
858.01
931.88
854.53
868.57
149
All GND'd Irradiation
865.06
879.52
943.66
870.89
885.16
150
Biased Irradiation
832.00
847.14
891.64
843.24
857.47
151
Biased Irradiation
842.31
877.40
876.83
868.60
884.51
152
Biased Irradiation
858.67
868.53
902.31
869.46
878.36
153
Biased Irradiation
849.06
864.61
901.98
866.68
871.46
154
Biased Irradiation
860.72
865.94
867.24
869.90
870.68
199
Control Unit
855.07
878.17
904.11
859.64
858.71
200
Control Unit
867.04
873.91
962.94
876.37
880.56
All GND'd Irradiation Statistics
Average All GND'd
854.72
870.11
942.70
861.39
870.78
Std Dev All GND'd
8.81
10.66
9.32
8.98
14.76
Ps90%/90% (+KTL) All GND'd
878.88
899.34
968.24
886.00
911.25
Ps90%/90% (-KTL) All GND'd
830.57
840.87
917.15
836.77
830.31
Biased Irradiation Statistics
Average Biased
848.55
864.72
888.00
863.58
872.50
Std Dev Bias
11.87
11.02
15.57
11.43
10.11
Ps90%/90% (+KTL) Biased
881.11
894.94
930.68
894.93
900.22
Ps90%/90% (-KTL) Biased
816.00
834.51
845.32
832.23
844.77
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
1500
1500
1500
1500
1500
Status (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 21 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Appendix A
Picture of one among ten samples used in the test. The date code and related identification
numbers should be correlated with the provided information in the second page of this report.
Figure A1: Top View showing date code
Figure A2: Side View showing serial number
P a g e 22 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Appendix B
Radiation Bias Connection Tables
Table B1: Biased Conditions
Pin
1
Function
NC
Connection / Bias
NC
2
3
4
5
VIN
NC
GND
TRIM
To 15V, 0.1uF decoupling to pin 4
NC
To -15V, 0.1uF decoupling to pin 2
NC
6
7
8
VOUT
NC
NC
NC
NC
NC
Table B2: All GND’d
Pin
1
Function
NC
Connection / Bias
GND
2
3
4
5
VIN
NC
GND
TRIM
GND
GND
GND
GND
6
7
8
VOUT
NC
NC
GND
GND
GND
P a g e 23 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Figure B1: Total Dose Bias Circuit
Figure B2: Pin-Out
P a g e 24 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Figure B3: Bias Board (top view)
Figure B4: Bias Board (bottom view)
P a g e 25 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Appendix C
P a g e 26 | 27
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021BMH-10 1245822 W1
Appendix D
Table D1: Electrical Characteristics of Device-Under-Test
*(0mA ≤ IOUT ≤ 10mA)
†
(1.7mA ≤ IOUT ≤ 10mA)
P a g e 27 | 27
LINEAR TECHNOLOGY CORPORATION
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