TID LDR RH1021BMH-10 1245822 W1 Total Ionization Dose (TID) Test Results of the RH1021BMH-10 Precision 10V Reference @ Low Dose Rate (LDR) LDR = 10 mrads(Si)/s 22 September 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the Product Engineering and Applications Signal Group from Linear Technology for their help with the board design and assembly as well as the data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd from Defense Microelectronics Activity (DMEA) for the extensive work for board setup and continuous dosimetry monitoring throughout the ELDRS tests. P a g e 1 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 TID LDR Testing of the RH1021BMH-10 Precision 10V Reference Part Type Tested: RH1021-10 Precision 10V Reference Traceability Information: Fab Lot# 1245822.1; Wafer # 1; Assembly Lot # 724755.1; Date Code: 1332A. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units for unbiased irradiation. Serial numbers 145 to 149 had all pins tied to ground during irradiation. Serial numbers 150 to 154 were biased during irradiation. Serial numbers 199 and 200 were used as control. See Appendix B for the radiation bias connection tables. Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test increments: pre-irradiation, 10 Krads(Si), 22 Krads(Si), 50 Krads(Si), 100 Krads(Si). Radiation dose: 10 mrads(Si)/sec. Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D. Test Hardware and Software: LTX pre-irradiation test program ERHB102110.01; LTX postirradiation test program ERHB102110.01; Test Board LT1021; Test Setup 04-04-0540. Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750. SUMMARY ALL 10 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 1.0 Overview and Background Among other radiation effects, Total Ionizing Dose (TID) may affect circuits’ electrical characteristics, causing parametric and/or functional failures in integrated circuits. During gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge trapping in the transistors’ dielectrics and interface regions, affecting hence the devices’ basic features. Such effects warrant testing and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and process technology. Hence is the requirement per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 to not exceed the allowed time from the end of an incremented irradiation and an electrical test to more than one hour. Additionally, the total time from the end of one incremental irradiation to the start of the next incremental step should be less than two hours. 2.0 Radiation facility and test equipment The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry. 3.0 Test Conditions The 10 test samples and two control units were electrically tested at 25°C prior to irradiation. The parts were then placed in a lead/aluminum container and aligned with the radiation source, Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at +/- 15V and other five had all pads grounded. The devices were irradiated up to 100 Krad(Si) with increments of 10, 20, and 50 Krads(Si). After each irradiation the samples were transported in dry ice to Linear Technology testing facility. Testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2 control). The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must pass the datasheet limits. If any of the measured parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted and if valid the lot will be scrapped. P a g e 3 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - Output Voltage (V) Output Voltage Temperature Coefficient (ppm/°C) Line Regulation with condition 7.2V ≤ VIN ≤ 10V (ppm/V) Line Regulation with condition 710V ≤ VIN ≤ 40V (ppm/V) Load Regulation (Sourcing Current) (ppm/mA) Load Regulation (Sinking Current) (ppm/mA) Supply Current (Series Mode) (mA) Minimum Supply Current (Shunt Mode) (µA) Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 5.0 Test Results All ten samples passed the post-irradiation electrical tests. All measurements of the eight listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated by adding to and subtracting from mean the product of standard deviation and the tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) However, in most cases, mean and standard deviation are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dotted lines with diamond markers are the average of the measured data points of five samples irradiated under electrical bias while the dashed lines with X-markers are the average of measured data points of five units irradiated with all pins tied to ground. The solid lines with triangle markers are the average of the data points after the calculation of the KTL statistics on the sample irradiated in the biased setup. The solid lines with square symbols are the average of the measured points after the application of the KTL statistics on the five samples irradiated with all pins grounded. The orange solid lines with circle markers are the specification limits. The 22 Krads(Si) test limits are using Linear Technology datasheet 20 Krads(Si) specification limits. P a g e 5 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 10.0800 10.0600 Specification MAX 10.0400 Ps90%/90% (+KTL) All GND'd Ps90%/90% (+KTL) Biased Vout (V) 10.0200 Average All GND'd 10.0000 Average Biased 9.9800 Ps90%/90% (-KTL) All GND'd 9.9600 Ps90%/90% (-KTL) Biased 9.9400 Specification MIN 9.9200 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.1 Plot of Output Voltage versus Total Dose The post-irradiation measured values are within specification datasheet limits. P a g e 6 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.1: Raw data for Output Voltage (V) versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) under the orange headers) Parameter Total Dose (Krad(Si)) @ 10 mrads(Si)/second VOUT Unit # (V) 0 10 22 50 100 145 All GND'd Irradiation 10.0192 10.0193 10.0206 10.0200 10.0193 146 All GND'd Irradiation 10.0126 10.0129 10.0146 10.0136 10.0134 147 All GND'd Irradiation 10.0169 10.0171 10.0185 10.0175 10.0170 148 All GND'd Irradiation 10.0055 10.0058 10.0075 10.0068 10.0067 149 All GND'd Irradiation 10.0088 10.0093 10.0107 10.0100 10.0099 150 Biased Irradiation 10.0163 10.0141 10.0140 10.0120 10.0093 151 Biased Irradiation 10.0114 10.0096 10.0096 10.0077 10.0056 152 Biased Irradiation 10.0066 10.0046 10.0048 10.0030 10.0008 153 Biased Irradiation 10.0143 10.0121 10.0120 10.0103 10.0079 154 Biased Irradiation 10.0166 10.0145 10.0146 10.0128 10.0104 199 Control Unit 10.0081 10.0078 10.0088 10.0081 10.0077 200 Control Unit 10.0129 10.0124 10.0134 10.0128 10.0124 All GND'd Irradiation Statistics Average All GND'd 10.0126 10.0129 10.0144 10.0136 10.0133 Std Dev All GND'd 0.0056 0.0055 0.0054 0.0054 0.0051 Ps90%/90% (+KTL) All GND'd 10.0280 10.0280 10.0292 10.0283 10.0273 Ps90%/90% (-KTL) All GND'd 9.9972 9.9977 9.9996 9.9988 9.9992 Biased Irradiation Statistics Average Biased 10.0130 10.0110 10.0110 10.0091 10.0068 Std Dev Biased 0.0042 0.0041 0.0040 0.0039 0.0038 Ps90%/90% (+KTL) Biased 10.0245 10.0221 10.0219 10.0200 10.0173 Ps90%/90% (-KTL) Biased 10.0016 9.9999 10.0001 9.9983 9.9963 Specification MIN 9.95 9.95 9.945 9.942 9.938 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Specification MAX 10.05 10.05 10.055 10.06 10.06 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS P a g e 7 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 8.00 Specification MAX 6.00 Ps90%/90% (+KTL) Biased TCVOUT (ppm/°C) 4.00 Ps90%/90% (+KTL) All GND'd 2.00 Average Biased 0.00 Average All GND'd -2.00 Ps90%/90% (-KTL) All GND'd -4.00 Ps90%/90% (-KTL) Biased -6.00 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.2: Plot of Output Voltage Temperature Coefficient versus Total Dose The measured values of 10 samples are under datasheet maximum limits. P a g e 8 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.2: Raw data for voltage output temperature coefficient (ppm/°C) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL under the second orange header) Parameter Total Dose (Krad(Si)) @ 10 mrads(Si)/second TCVOUT Unit # (ppm/°C) 0 10 22 50 100 145 All GND'd Irradiation 0.3881 -0.0770 -1.2355 -1.1600 -1.6247 146 All GND'd Irradiation -0.9957 -0.4406 -1.6485 -1.3777 -2.0438 147 All GND'd Irradiation -1.1644 -0.6181 -1.8973 -2.5111 -3.4232 148 All GND'd Irradiation -1.6671 -0.5600 -1.3661 -1.5108 -2.5335 149 All GND'd Irradiation -0.1604 -0.0394 -1.0380 -0.5861 -1.5803 150 Biased Irradiation 0.7824 1.9343 0.2886 0.9500 0.3057 151 Biased Irradiation -1.7956 -0.5325 -1.1580 -1.1573 -2.1015 152 Biased Irradiation -0.6651 -0.3606 -0.8895 -1.7197 -1.6474 153 Biased Irradiation 1.4027 2.6584 0.8966 0.8847 0.7848 154 Biased Irradiation -1.6466 -0.4440 -0.7745 -2.0780 -2.6373 199 Control Unit -2.0499 -1.0789 -1.4922 -1.5279 -0.5758 200 Control Unit -1.5130 0.3365 -0.5778 0.8164 1.1075 All GND'd Irradiation Statistics Average All GND'd -0.7199 -0.3470 -1.4371 -1.4291 -2.2411 Std Dev All GND'd 0.8233 0.2716 0.3397 0.7005 0.7646 Ps90%/90% (+KTL) All GND'd 1.5377 0.3978 -0.5057 0.4917 -0.1446 Ps90%/90% (-KTL) All GND'd -2.9775 -1.0918 -2.3685 -3.3500 -4.3376 Biased Irradiation Statistics Average Biased -0.3844 0.6511 -0.3274 -0.6241 -1.0591 Std Dev Biased 1.4334 1.5247 0.8780 1.4450 1.5154 Ps90%/90% (+KTL) Biased 3.5459 4.8320 2.0800 3.3382 3.0962 Ps90%/90% (-KTL) Biased -4.3148 -3.5297 -2.7348 -4.5863 -5.2145 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 5 5 5 5 7 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 9 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 ΔVOUT/ΔVIN (ppm/V) (11.5V ≤ VIN ≤= 14.5V) 6.00 Specification MAX 5.00 Ps90%/90% (+KTL) All GND'd 4.00 Ps90%/90% (+KTL) Biased 3.00 Average All GND'd 2.00 Average Biased 1.00 Ps90%/90% (-KTL) Biased 0.00 Ps90%/90% (-KTL) All GND'd -1.00 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.3: Plot of Line Regulation (11.5V ≤ VIN ≤ 14.5V) versus Total Dose All measured data points are lower than the datasheet specification maximum. P a g e 10 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.3: Raw data for line regulation (ppm/V) with 11.5V ≤ VIN ≤ 14.5V versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Total Dose (Krad(Si)) @ 10 mrads(Si)/second Parameter ΔVOUT/ΔVIN (11.5V≤VIN≤14.5V) Unit # (ppm/V) 0 10 22 50 100 145 All GND'd Irradiation -0.0037 2.57E-07 0.0120 -0.0258 -0.0060 146 All GND'd Irradiation 0.0024 7.26E-06 -0.0350 -0.0163 -0.0135 147 All GND'd Irradiation -0.0142 -1.34E-05 -0.0434 -0.0399 0.0002 148 All GND'd Irradiation -0.0093 -1.89E-05 0.0098 -0.0047 -0.0102 149 All GND'd Irradiation -0.0014 -4.48E-06 -0.0195 0.0245 -0.0023 150 Biased Irradiation -0.0056 -6.78E-06 -0.0189 -0.0279 -0.0029 151 Biased Irradiation -0.0067 -3.71E-06 -0.0173 -0.0065 -0.0150 152 Biased Irradiation -0.0080 -2.39E-05 -0.0140 -0.0215 -0.0121 153 Biased Irradiation 0.0061 1.62E-07 -0.0386 -0.0108 -0.0128 154 Biased Irradiation -0.0139 -1.22E-05 -0.0070 -0.0305 -0.0004 199 Control Unit -0.0032 -3.40E-06 -0.0170 -0.0395 -0.0022 200 Control Unit -0.0004 -7.75E-06 -0.0366 0.0393 -0.0071 All GND'd Irradiation Statistics Average All GND'd -0.0053 -5.85E-06 -0.0152 -0.0125 -0.0064 Std Dev All GND'd 0.0066 1.05E-05 0.0253 0.0243 0.0056 Ps90%/90% (+KTL) All GND'd 0.0128 2.28E-05 0.0543 0.0543 0.0089 Ps90%/90% (-KTL) All GND'd -0.0233 -3.46E-05 -0.0847 -0.0792 -0.0217 Biased Irradiation Statistics Average Biased -0.0056 -9.28E-06 -0.0192 -0.0194 -0.0086 Std Dev Biased 0.0073 9.33E-06 0.0118 0.0105 0.0065 Ps90%/90% (+KTL) Biased 0.0144 1.63E-05 0.0131 0.0094 0.0093 Ps90%/90% (-KTL) Biased -0.0256 -3.49E-05 -0.0515 -0.0482 -0.0266 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 4 4 4 4.5 5 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 11 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 ∆VOUT/∆VIN (ppm/V) (14.5V ≤ VIN ≤ 40V) 2.50 Specification MAX 2.00 Ps90%/90% (+KTL) All GND'd 1.50 Ps90%/90% (+KTL) Biased 1.00 Average All GND'd Average Biased 0.50 Ps90%/90% (-KTL) Biased 0.00 Ps90%/90% (-KTL) All GND'd -0.50 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.4: Plot of Line Regulation (14.5V ≤ VIN ≤ 40V) versus Total Dose All measured data points are well under datasheet upper limits. P a g e 12 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.4: Raw data for line regulation (ppm/V) with 14.5V ≤ VIN ≤ 40V versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Total Dose (Krad(Si)) @ 10 mrads(Si)/second Parameter ∆VOUT/∆VIN (14.5V ≤ VIN ≤ 40V) Unit # (ppm/V) 0 10 22 50 100 145 All GND'd Irradiation -0.0302 -0.0377 -0.0551 0.0021 -0.0294 146 All GND'd Irradiation -0.0273 -0.0528 -0.0182 -0.0390 -0.0469 147 All GND'd Irradiation -0.0273 -0.0327 -0.0278 -0.0021 -0.0505 148 All GND'd Irradiation -0.0339 -0.0387 -0.0440 -0.0456 -0.0474 149 All GND'd Irradiation -0.0124 -0.0303 -0.0092 -0.0554 -0.0313 150 Biased Irradiation -0.0271 -0.0437 -0.0448 -0.0126 -0.0379 151 Biased Irradiation -0.0280 -0.0264 -0.0153 -0.0312 -0.0419 152 Biased Irradiation -0.0385 -0.0324 -0.0272 -0.0478 -0.0425 153 Biased Irradiation -0.0268 -0.0313 -0.0092 -0.0434 -0.0266 154 Biased Irradiation -0.0267 -0.0351 -0.0428 -0.0212 -0.0395 199 Control Unit -0.0305 -0.0394 -0.0433 0.0062 -0.0446 200 Control Unit -0.0090 -0.0297 -0.0074 -0.0705 -0.0187 All GND'd Irradiation Statistics Average All GND'd -0.0262 -0.0385 -0.0309 -0.0280 -0.0411 Std Dev All GND'd 0.0082 0.0087 0.0187 0.0263 0.0100 Ps90%/90% (+KTL) All GND'd -0.0038 -0.0145 0.0204 0.0440 -0.0138 Ps90%/90% (-KTL) All GND'd -0.0487 -0.0624 -0.0821 -0.1000 -0.0684 Biased Irradiation Statistics Average Biased -0.0294 -0.0338 -0.0279 -0.0312 -0.0377 Std Dev Biased 0.0051 0.0064 0.0159 0.0147 0.0064 Ps90%/90% (+KTL) Biased -0.0154 -0.0162 0.0158 0.0092 -0.0200 Ps90%/90% (-KTL) Biased -0.0435 -0.0513 -0.0716 -0.0716 -0.0554 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 2 2 2 2 2 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 13 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 30 Specification MAX ∆VOUT/∆IOUT (ppm/mA) (Source 0≤ IOUT ≤10mA) 25 Ps90%/90% (+KTL) All GND'd 20 Ps90%/90% (+KTL) Biased 15 Average All GND'd 10 Average Biased 5 Ps90%/90% (-KTL) Biased 0 Ps90%/90% (-KTL) All GND'd -5 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.5: Plot of Load Regulation (Sourcing 0 ≤ IOUT ≤ 10mA) versus Total Dose The measured parameters are well under the specification maximum limits. P a g e 14 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.5: Raw data for load regulation sourcing (ppm/mA) with 0 ≤ IOUT ≤ 10mA versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Total Dose (Krad(Si)) @ 10 mrads(Si)/second Parameter ∆VO/∆IO (Source 0≤ IOUT ≤10mA) Unit # (ppm/mA) 0 10 22 50 100 145 All GND'd Irradiation -1.1019 -1.1117 -0.9086 -1.1749 -1.1769 146 All GND'd Irradiation -1.0807 -1.1302 -0.8722 -1.1816 -1.1306 147 All GND'd Irradiation -1.1235 -1.1694 -0.9895 -1.1856 -1.1772 148 All GND'd Irradiation -1.1547 -1.1238 -0.9578 -1.2230 -1.1820 149 All GND'd Irradiation -1.3616 -1.1001 -0.9308 -1.1914 -1.1712 150 Biased Irradiation -1.0262 -1.1207 -0.9299 -1.1269 -1.1470 151 Biased Irradiation -1.1050 -1.1240 -1.0597 -1.1488 -1.1438 152 Biased Irradiation -1.0560 -1.1409 -1.0356 -1.1650 -1.1507 153 Biased Irradiation -1.1102 -1.1647 -1.0375 -1.1763 -1.2130 154 Biased Irradiation -1.0749 -1.1359 -1.0852 -1.1618 -1.1919 199 Control Unit -1.0618 -1.0524 -0.9615 -1.1569 -1.1873 200 Control Unit -1.0640 -1.0213 -0.8796 -1.1269 -1.1304 All GND'd Irradiation Statistics Average All GND'd -1.1645 -1.1270 -0.9318 -1.1913 -1.1676 Std Dev All GND'd 0.1135 0.0263 0.0450 0.0187 0.0210 Ps90%/90% (+KTL) All GND'd -0.8532 -1.0548 -0.8084 -1.1400 -1.1099 Ps90%/90% (-KTL) All GND'd -1.4758 -1.1992 -1.0551 -1.2426 -1.2253 Biased Irradiation Statistics Average Biased -1.0744 -1.1372 -1.0296 -1.1557 -1.1693 Std Dev Biased 0.0349 0.0175 0.0592 0.0189 0.0313 Ps90%/90% (+KTL) Biased -0.9786 -1.0894 -0.8672 -1.1040 -1.0835 Ps90%/90% (-KTL) Biased -1.1702 -1.1851 -1.1920 -1.2074 -1.2551 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 25 25 25 25 25 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 15 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 120 ∆VOUT/∆IOUT (ppm/mA) (Shunt 1.7mA ≤ IOUT ≤ 10mA) 100 Specification MAX Ps90%/90% (+KTL) All GND'd 80 Ps90%/90% (+KTL) Biased 60 Average All GND'd 40 Average Biased 20 Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) All GND'd 0 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.6: Plot of Load Regulation (Shunting 1.7mA ≤ IOUT ≤ 10mA) versus Total Dose The maximum limits at different post-irradiation doses of the parameter are at 100 ppm/mA and the measured values are in the 2 ppm/mA range. P a g e 16 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.6: Raw data for load regulation shunting (ppm/mA) with 1.7mA ≤ IOUT ≤ 10mA versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Total Dose (Krad(Si)) @ 10 mrads(Si)/second Parameter ∆VO/∆IO(Shunt 1.7mA≤IO≤10mA) Unit # (ppm/mA) 0 10 22 50 100 145 All GND'd Irradiation 2.2634 2.2069 1.2043 2.8792 1.9767 146 All GND'd Irradiation 1.5021 2.1301 1.3572 2.1925 2.1302 147 All GND'd Irradiation 3.0248 2.2069 1.5867 2.1925 2.2070 148 All GND'd Irradiation 2.4918 1.6697 2.5810 2.2688 2.6674 149 All GND'd Irradiation 1.9589 1.5929 2.1986 2.2688 1.9767 150 Biased Irradiation 2.7964 2.2069 1.8927 2.4214 2.8977 151 Biased Irradiation 2.3395 1.5162 1.8162 2.1925 1.6697 152 Biased Irradiation 2.1873 1.9767 1.5867 2.1925 1.9000 153 Biased Irradiation 2.1873 2.0534 2.1221 2.1925 2.2837 154 Biased Irradiation 2.6441 1.9767 1.6632 2.1925 2.2070 199 Control Unit 1.5021 1.9767 1.8927 2.1925 2.8209 200 Control Unit 2.0350 1.6697 2.1986 2.5740 1.9000 All GND'd Irradiation Statistics Average All GND'd 2.2482 1.9613 1.7856 2.3604 2.1916 Std Dev All GND'd 0.5707 0.3041 0.5840 0.2925 0.2841 Ps90%/90% (+KTL) All GND'd 3.8132 2.7951 3.3869 3.1625 2.9705 Ps90%/90% (-KTL) All GND'd 0.6832 1.1275 0.1842 1.5583 1.4127 Biased Irradiation Statistics Average Biased 2.4309 1.9460 1.8162 2.2383 2.1916 Std Dev Biased 0.2766 0.2580 0.2095 0.1024 0.4649 Ps90%/90% (+KTL) Biased 3.1894 2.6534 2.3905 2.5190 3.4665 Ps90%/90% (-KTL) Biased 1.6724 1.2385 1.2418 1.9576 0.9167 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 100 100 100 100 100 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 17 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Supply Current (mA) 1.80 1.70 Specification MAX 1.60 Ps90%/90% (+KTL) All GND'd 1.50 Ps90%/90% (+KTL) Biased 1.40 Average All GND'd 1.30 Average Biased 1.20 Ps90%/90% (-KTL) Biased 1.10 Ps90%/90% (-KTL) All GND'd 1.00 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.7: Plot of Supply Current versus Total Dose The average measured values of 10 samples are within datasheet maximum limits. P a g e 18 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.7: Raw data table for supply current (mA) versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Total Dose (Krad(Si)) @ 10 mrads(Si)/second Parameter IS Unit # (mA) 0 10 22 50 100 145 All GND'd Irradiation 1.1063 1.1234 1.2255 1.0984 1.0713 146 All GND'd Irradiation 1.1058 1.1258 1.2435 1.1056 1.1068 147 All GND'd Irradiation 1.1127 1.1322 1.2029 1.1112 1.1117 148 All GND'd Irradiation 1.1046 1.1188 1.2135 1.1035 1.1087 149 All GND'd Irradiation 1.1243 1.1418 1.2270 1.1213 1.1262 150 Biased Irradiation 1.0802 1.0932 1.1501 1.0774 1.0776 151 Biased Irradiation 1.1012 1.1427 1.1345 1.1169 1.1195 152 Biased Irradiation 1.1163 1.1297 1.1671 1.1130 1.1060 153 Biased Irradiation 1.1014 1.1141 1.1602 1.1038 1.1009 154 Biased Irradiation 1.1184 1.1201 1.1186 1.1138 1.0999 199 Control Unit 1.1191 1.1418 1.1759 1.1258 1.1209 200 Control Unit 1.1323 1.1382 1.2599 1.1439 1.1435 All GND'd Irradiation Statistics Average All GND'd 1.1108 1.1284 1.2225 1.1080 1.1049 Std Dev All GND'd 0.0082 0.0089 0.0153 0.0087 0.0203 Ps90%/90% (+KTL) All GND'd 1.1333 1.1528 1.2644 1.1319 1.1605 Ps90%/90% (-KTL) All GND'd 1.0883 1.1040 1.1805 1.0841 1.0493 Biased Irradiation Statistics Average Biased 1.1035 1.1200 1.1461 1.1050 1.1008 Std Dev Biased 0.0153 0.0185 0.0196 0.0162 0.0152 Ps90%/90% (+KTL) Biased 1.1454 1.1706 1.2000 1.1493 1.1423 Ps90%/90% (-KTL) Biased 1.0616 1.0693 1.0922 1.0606 1.0592 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 1.7 1.7 1.7 1.7 1.7 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 19 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Minimum Supply Current (uA) 1600 1500 Specification MAX 1400 Ps90%/90% (+KTL) All GND'd 1300 Ps90%/90% (+KTL) Biased 1200 Average All GND'd 1100 Average Biased 1000 Ps90%/90% (-KTL) Biased 900 Ps90%/90% (-KTL) All GND'd 800 700 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.8: Plot of Minimum Supply Current versus Total Dose The average measured values of 10 samples are within datasheet maximum limits. P a g e 20 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Table 5.8: Raw data table for supply current (mA) versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Total Dose (Krad(Si)) @ 10 mrads(Si)/s Parameter Imin Unit # (uA) 0 10 22 50 100 145 All GND'd Irradiation 853.14 864.07 948.34 852.07 848.63 146 All GND'd Irradiation 847.16 865.94 954.51 858.55 868.04 147 All GND'd Irradiation 862.59 882.99 935.10 870.89 883.50 148 All GND'd Irradiation 845.67 858.01 931.88 854.53 868.57 149 All GND'd Irradiation 865.06 879.52 943.66 870.89 885.16 150 Biased Irradiation 832.00 847.14 891.64 843.24 857.47 151 Biased Irradiation 842.31 877.40 876.83 868.60 884.51 152 Biased Irradiation 858.67 868.53 902.31 869.46 878.36 153 Biased Irradiation 849.06 864.61 901.98 866.68 871.46 154 Biased Irradiation 860.72 865.94 867.24 869.90 870.68 199 Control Unit 855.07 878.17 904.11 859.64 858.71 200 Control Unit 867.04 873.91 962.94 876.37 880.56 All GND'd Irradiation Statistics Average All GND'd 854.72 870.11 942.70 861.39 870.78 Std Dev All GND'd 8.81 10.66 9.32 8.98 14.76 Ps90%/90% (+KTL) All GND'd 878.88 899.34 968.24 886.00 911.25 Ps90%/90% (-KTL) All GND'd 830.57 840.87 917.15 836.77 830.31 Biased Irradiation Statistics Average Biased 848.55 864.72 888.00 863.58 872.50 Std Dev Bias 11.87 11.02 15.57 11.43 10.11 Ps90%/90% (+KTL) Biased 881.11 894.94 930.68 894.93 900.22 Ps90%/90% (-KTL) Biased 816.00 834.51 845.32 832.23 844.77 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 1500 1500 1500 1500 1500 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 21 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Appendix A Picture of one among ten samples used in the test. The date code and related identification numbers should be correlated with the provided information in the second page of this report. Figure A1: Top View showing date code Figure A2: Side View showing serial number P a g e 22 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Appendix B Radiation Bias Connection Tables Table B1: Biased Conditions Pin 1 Function NC Connection / Bias NC 2 3 4 5 VIN NC GND TRIM To 15V, 0.1uF decoupling to pin 4 NC To -15V, 0.1uF decoupling to pin 2 NC 6 7 8 VOUT NC NC NC NC NC Table B2: All GND’d Pin 1 Function NC Connection / Bias GND 2 3 4 5 VIN NC GND TRIM GND GND GND GND 6 7 8 VOUT NC NC GND GND GND P a g e 23 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Figure B1: Total Dose Bias Circuit Figure B2: Pin-Out P a g e 24 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Figure B3: Bias Board (top view) Figure B4: Bias Board (bottom view) P a g e 25 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Appendix C P a g e 26 | 27 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021BMH-10 1245822 W1 Appendix D Table D1: Electrical Characteristics of Device-Under-Test *(0mA ≤ IOUT ≤ 10mA) † (1.7mA ≤ IOUT ≤ 10mA) P a g e 27 | 27 LINEAR TECHNOLOGY CORPORATION