TID LDR RH1021CMH-5 10214210 W10 Total Ionization Dose (TID) Test Results of the RH1021CMH-5 Precision 5V Reference @ Low Dose Rate (LDR) LDR = 10 mrads(Si)/s 22 September 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the Product Engineering and Applications Signal Group from Linear Technology for their help with the board design and assembly as well as the data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd from Defense Microelectronics Activity (DMEA) for the extensive work for board setup and continuous dosimetry monitoring throughout the ELDRS tests. P a g e 1 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 TID LDR Testing of the RH1021CMH-5 Precision 5V Reference Part Type Tested: RH1021-5 Precision 5V Reference Traceability Information: Fab Lot# 10214210.1; Wafer # 10; Assembly Lot # 697997.1; Date Code: 1217A. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units for unbiased irradiation. Serial numbers 334, 336 to 339 had all pins tied to ground during irradiation. Serial numbers 340 to 343 and 345 were biased during irradiation. Serial numbers 323 and 324 were used as control. See Appendix B for the radiation bias connection tables. Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test increments: pre-irradiation, 10 Krads(Si), 22 Krads(Si), 50 Krads(Si), 100 Krads(Si). Radiation dose: 10 mrads(Si)/sec. Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D. Test Hardware and Software: LTX pre-irradiation test program EQCM10215.02; LTX postirradiation test program ERHC10215.00; Test Board LT1021; Test Setup 04-04-0540. Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750. SUMMARY ALL 10 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 1.0 Overview and Background Among other radiation effects, Total Ionizing Dose (TID) may affect circuits’ electrical characteristics, causing parametric and/or functional failures in integrated circuits. During gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge trapping in the transistors’ dielectrics and interface regions, affecting hence the devices’ basic features. Such effects warrant testing and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and process technology. Hence is the requirement per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 to not exceed the allowed time from the end of an incremented irradiation and an electrical test to more than one hour. Additionally, the total time from the end of one incremental irradiation to the start of the next incremental step should be less than two hours. 2.0 Radiation facility and test equipment The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry. 3.0 Test Conditions The 10 test samples and two control units were electrically tested at 25°C prior to irradiation. The parts were then placed in a lead/aluminum container and aligned with the radiation source, Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at +/- 15V and other five had all pads grounded. The devices were irradiated up to 100 Krad(Si) with increments of 10, 22, and 50 Krads(Si). After each irradiation the samples were transported in dry ice to Linear Technology testing facility. Testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2 control). The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must pass the datasheet limits. If any of the measured parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted and if valid the lot will be scrapped. P a g e 3 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - Output Voltage (V) Output Voltage Temperature Coefficient (ppm/°C) Line Regulation with condition 7.2V ≤ VIN ≤ 10V (ppm/V) Line Regulation with condition 710V ≤ VIN ≤ 40V (ppm/V) Load Regulation (Sourcing Current) (ppm/mA) Load Regulation (Sinking Current) (ppm/mA) Supply Current (Series Mode) (mA) Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 5.0 Test Results All ten samples passed the post-irradiation electrical tests. All measurements of the seven listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated by adding to and subtracting from mean the product of standard deviation and the tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) However, in most cases, mean and standard deviation are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HBK814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dotted lines with diamond markers are the average of the measured data points of five samples irradiated under electrical bias while the dashed lines with X-markers are the average of measured data points of five units irradiated with all pins tied to ground. The solid lines with triangle markers are the average of the data points after the calculation of the KTL statistics on the sample irradiated in the biased setup. The solid lines with square symbols are the average of the measured points after the application of the KTL statistics on the five samples irradiated with all pins grounded. The orange solid lines with circle markers are the specification limits. The 22 Krads(Si) test limits are using Linear Technology datasheet 20 Krads(Si) specification limits. P a g e 5 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 5.0200 5.0150 Specification MAX 5.0100 Ps90%/90% (+KTL) All GND'd Ps90%/90% (+KTL) Biased Vout (V) 5.0050 Average Biased 5.0000 Average All GND'd 4.9950 Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) All GND'd 4.9900 Specification MIN 4.9850 4.9800 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.1 Plot of Output Voltage versus Total Dose All ten samples passed the output voltage test at each post-irradiation interval. Note the KTL square and triangle markers are slightly above the pre-irradiation datasheet limits, due to the small sample population and in this report the sample size is five. P a g e 6 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.1: Raw data for Output Voltage (V) versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) under the orange headers) Parameter VOUT Total Dose (Krad(Si)) at 10 mrads(Si)/second Unit # (V) 0 10 22 50 100 334 All GND'd Irradiation 4.9994 5.0006 5.0016 5.0025 5.0045 336 All GND'd Irradiation 5.0018 5.0029 5.0038 5.0049 5.0070 337 All GND'd Irradiation 4.9992 5.0006 5.0015 5.0025 5.0048 338 All GND'd Irradiation 5.0020 5.0033 5.0043 5.0057 5.0081 339 All GND'd Irradiation 4.9998 5.0009 5.0019 5.0030 5.0052 340 Biased-Irradiation 4.9995 5.0012 5.0025 5.0035 5.0046 341 Biased-Irradiation 5.0020 5.0037 5.0047 5.0059 5.0069 342 Biased-Irradiation 5.0021 5.0036 5.0046 5.0056 5.0065 343 Biased-Irradiation 5.0016 5.0030 5.0040 5.0050 5.0058 345 Biased-Irradiation 5.0020 5.0036 5.0049 5.0058 5.0067 323 Control Unit 5.0020 5.0022 5.0024 5.0024 5.0021 324 Control Unit 4.9997 5.0000 5.0003 5.0001 5.0000 All GND'd Irradiation Statistics Average All GND'd 5.0005 5.0017 5.0026 5.0037 5.0059 Std Dev All GND'd 0.0013 0.0013 0.0013 0.0015 0.0015 Ps90%/90% (+KTL) All GND'd 5.0041 5.0053 5.0062 5.0078 5.0101 Ps90%/90% (-KTL) All GND'd 4.9968 4.9980 4.9990 4.9997 5.0017 Biased-Irradiation Statistics Average Biased 5.0014 5.0030 5.0041 5.0052 5.0061 Std Dev Biased 0.0011 0.0010 0.0010 0.0010 0.0009 Ps90%/90% (+KTL) Biased 5.0045 5.0058 5.0069 5.0079 5.0086 Ps90%/90% (-KTL) Biased 4.9984 5.0002 5.0014 5.0024 5.0036 Specification MIN 4.9975 4.9945 4.993 4.991 4.9875 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Specification MAX 5.0025 5.0055 5.007 5.009 5.0125 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd Status (-KTL) Biased Status (+KTL) Biased FAIL FAIL PASS PASS PASS PASS PASS PASS PASS PASS PASS FAIL PASS FAIL PASS PASS PASS PASS PASS PASS P a g e 7 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 TCVout (ppm/C) 30 25 Specification MAX 20 Ps90%/90% (+KTL) All GND'd 15 Ps90%/90% (+KTL) Biased 10 Average Biased 5 Average All GND'd 0 Ps90%/90% (-KTL) Biased -5 Ps90%/90% (-KTL) All GND'd -10 -15 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.2: Plot of Output Voltage Temperature Coefficient versus Total Dose The measured values of 10 samples are under datasheet maximum limits. P a g e 8 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.2: Raw data for voltage output temperature coefficient (ppm/°C) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL under the second orange header) Parameter TCVOUT Total Dose (Krad(Si)) at 10 mrads(Si)/second Unit # (ppm/°C) 0 10 22 50 100 334 All GND'd Irradiation -1.6391 -4.9296 -4.1018 -3.4510 -2.9935 336 All GND'd Irradiation 1.8819 -0.0549 0.0039 0.6234 0.8329 337 All GND'd Irradiation -1.3206 -4.1598 -2.7175 -3.2128 -3.5509 338 All GND'd Irradiation 2.5956 0.6843 1.3854 1.5338 1.7228 339 All GND'd Irradiation -0.7640 -2.1650 -2.1863 -2.4756 -1.5167 340 Biased-Irradiation -0.7821 -2.7760 -1.7327 -1.0056 -2.0894 341 Biased-Irradiation 0.3353 -1.2078 -0.8351 -0.8782 -0.4610 342 Biased-Irradiation 1.4513 -0.3386 0.4685 0.5555 0.4765 343 Biased-Irradiation 1.0354 -0.5338 0.1730 0.5750 -0.0314 345 Biased-Irradiation 2.7456 0.6776 1.2738 2.5791 1.5271 323 Control Unit -0.1213 -1.2028 -1.2154 -1.5884 -1.4586 324 Control Unit -1.9747 -3.3525 -3.1274 -3.6538 -4.0282 All GND'd Irradiation Statistics Average All GND'd 0.1508 -2.1250 -1.5233 -1.3964 -1.1011 Std Dev All GND'd 1.9480 2.4589 2.1970 2.3104 2.3168 Ps90%/90% (+KTL) All GND'd 5.4922 4.6174 4.5009 4.9386 5.2515 Ps90%/90% (-KTL) All GND'd -5.1907 -8.8674 -7.5474 -7.7314 -7.4538 Biased-Irradiation Statistics Average Biased 0.9571 -0.8357 -0.1305 0.3651 -0.1157 Std Dev Biased 1.3096 1.2779 1.1712 1.4497 1.3296 Ps90%/90% (+KTL) Biased 4.5481 2.6681 3.0809 4.3404 3.5301 Ps90%/90% (-KTL) Biased -2.6339 -4.3396 -3.3419 -3.6101 -3.7614 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 20 20 20 20 25 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 9 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 15 Specification MAX ΔVout/ΔVin (ppm/V) (7.2V≤VIN≤10V) 13 Ps90%/90% (+KTL) All GND'd 11 Average All GND'd 9 Ps90%/90% (-KTL) All GND'd 7 5 Ps90%/90% (+KTL) Biased 3 Average Biased 1 Ps90%/90% (-KTL) Biased -1 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.3: Plot of Line Regulation (7.2V ≤ VIN ≤ 10V) versus Total Dose All measured data points are lower than the datasheet specification maximum. P a g e 10 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.3: Raw data for line regulation (ppm/V) with 7.2V ≤ VIN ≤ 10V versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Parameter ΔVOUT/ΔVIN (7.2V≤VIN≤10V) Total Dose (Krad(Si)) at 10 mrads(Si)/second Unit # (ppm/V) 0 10 22 50 100 334 All GND'd Irradiation -0.0058 0.0290 0.0315 0.0253 0.0964 336 All GND'd Irradiation 0.0036 0.0199 0.0276 0.0343 0.0975 337 All GND'd Irradiation -0.0013 0.0156 0.0280 0.0250 0.0922 338 All GND'd Irradiation 0.0047 0.0168 0.0342 0.0425 0.0948 339 All GND'd Irradiation 0.0025 0.0037 0.0135 0.0498 0.0916 340 Biased-Irradiation -0.0017 0.0124 0.0133 0.0589 0.0538 341 Biased-Irradiation 0.0027 0.0027 0.0238 0.0438 0.0503 342 Biased-Irradiation 0.0018 0.0126 0.0167 0.0611 0.0561 343 Biased-Irradiation 0.0014 0.0144 0.0171 0.0556 0.0528 345 Biased-Irradiation 0.0065 0.0085 0.0135 0.0064 0.0620 323 Control Unit 0.0080 0.0045 0.0081 0.0245 0.0036 324 Control Unit 0.0000 -0.0014 -0.0127 0.0152 -0.0066 All GND'd Irradiation Statistics Average All GND'd 0.0008 0.0170 0.0270 0.0354 0.0945 Std Dev All GND'd 0.0043 0.0091 0.0080 0.0108 0.0025 Ps90%/90% (+KTL) All GND'd 0.0125 0.0420 0.0489 0.0651 0.1014 Ps90%/90% (-KTL) All GND'd -0.0110 -0.0080 0.0050 0.0057 0.0875 Biased-Irradiation Statistics Average Biased 0.0021 0.0101 0.0169 0.0452 0.0550 Std Dev Biased 0.0029 0.0047 0.0043 0.0227 0.0044 Ps90%/90% (+KTL) Biased 0.0102 0.0229 0.0286 0.1073 0.0671 Ps90%/90% (-KTL) Biased -0.0059 -0.0027 0.0052 -0.0170 0.0429 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 12 12 12 14 15 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 11 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 15 ΔVout/ΔVin (ppm/V) (10V≤VIN≤40V) 13 11 Specification MAX 9 Ps90%/90% (+KTL) All GND'd 7 Average All GND'd 5 Ps90%/90% (-KTL) All GND'd 3 Ps90%/90% (+KTL) Biased Average Biased 1 Ps90%/90% (-KTL) Biased -1 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.4: Plot of Line Regulation (10V ≤ VIN ≤ 40V) versus Total Dose All measured data points are well under datasheet upper limits. P a g e 12 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.4: Raw data for line regulation (ppm/V) with 10V ≤ VIN ≤ 40V versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Parameter ΔVOUT/ΔVIN (10V≤VIN≤40V) Total Dose (Krad(Si)) at 10 mrads(Si)/second Unit # (ppm/V) 0 10 22 50 100 334 All GND'd Irradiation -0.0157 0.0086 0.0381 0.1333 0.2017 336 All GND'd Irradiation -0.0180 0.0106 0.0295 0.0825 0.2038 337 All GND'd Irradiation -0.0110 0.0091 0.0471 0.0759 0.2070 338 All GND'd Irradiation -0.0074 0.0165 0.0667 0.1140 0.2161 339 All GND'd Irradiation -0.0130 0.0078 0.0316 0.0667 0.1759 340 Biased-Irradiation 0.0512 0.0485 0.0819 0.0861 0.1062 341 Biased-Irradiation -0.0129 0.0104 0.0413 0.0715 0.1174 342 Biased-Irradiation -0.0139 0.0041 0.0370 0.0714 0.1048 343 Biased-Irradiation -0.0117 0.0009 0.0486 0.0655 0.1094 345 Biased-Irradiation -0.0105 0.0103 0.0516 0.0539 0.1065 323 Control Unit -0.0132 -0.0159 -0.0286 -0.0361 -0.0078 324 Control Unit -0.0119 -0.0180 -0.0083 -0.0061 -0.0089 All GND'd Irradiation Statistics Average All GND'd -0.0130 0.0105 0.0426 0.0945 0.2009 Std Dev All GND'd 0.0041 0.0035 0.0151 0.0281 0.0150 Ps90%/90% (+KTL) All GND'd -0.0018 0.0201 0.0840 0.1715 0.2421 Ps90%/90% (-KTL) All GND'd -0.0243 0.0009 0.0012 0.0175 0.1597 Biased-Irradiation Statistics Average Biased 0.0005 0.0148 0.0521 0.0697 0.1089 Std Dev Biased 0.0284 0.0192 0.0176 0.0116 0.0051 Ps90%/90% (+KTL) Biased 0.0784 0.0676 0.1005 0.1016 0.1227 Ps90%/90% (-KTL) Biased -0.0774 -0.0379 0.0037 0.0378 0.0950 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 6 6 6 6 7 Staus (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 13 | 25 LINEAR TECHNOLOGY CORPORATION ΔVout/ΔIout (ppm/mA) (Sourcing 0≤Iout≤10mA) TID LDR RH1021CMH-5 10214210 W10 20 19 18 17 16 15 14 13 12 11 10 9 8 7 6 5 4 3 2 1 0 -1 Specification MAX Ps90%/90% (+KTL) All GND'd Ps90%/90% (+KTL) Biased Average Biased Average All GND'd Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) All GND'd 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.5: Plot of Load Regulation (Sourcing 0 ≤ IOUT ≤ 10mA) versus Total Dose The measured parameters are well under the specification maximum limits. P a g e 14 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.5: Raw data for load regulation sourcing (ppm/mA) with 0 ≤ IOUT ≤ 10mA versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Parameter ΔVO/ΔIO (Source 0 ≤IOUT ≤ 10mA) Total Dose (Krad(Si)) at 10 mrads(Si)/second Unit # (ppm/mA) 0 10 22 50 100 334 All GND'd Irradiation -0.4495 -0.5088 -0.4300 -0.5064 -0.5530 336 All GND'd Irradiation -0.4159 -0.4640 -0.4201 -0.5439 -0.5005 337 All GND'd Irradiation -0.4304 -0.4872 -0.4263 -0.5584 -0.4351 338 All GND'd Irradiation -0.4210 -0.5011 -0.4320 -0.5002 -0.4682 339 All GND'd Irradiation -0.4353 -0.4687 -0.4401 -0.5545 -0.4877 340 Biased-Irradiation -0.4519 -0.5164 -0.4493 -0.5695 -0.5123 341 Biased-Irradiation -0.4303 -0.4825 -0.4174 -0.4947 -0.4822 342 Biased-Irradiation -0.4142 -0.4849 -0.4104 -0.5462 -0.4748 343 Biased-Irradiation -0.4534 -0.4912 -0.4204 -0.5538 -0.4852 345 Biased-Irradiation -0.3788 -0.4533 -0.4336 -0.5243 -0.4545 323 Control Unit -0.4323 -0.5053 -0.3868 -0.5046 -0.4788 324 Control Unit -0.4068 -0.4560 -0.3515 -0.4675 -0.4661 All GND'd Irradiation Statistics Average All GND'd -0.4304 -0.4860 -0.4297 -0.5327 -0.4889 Std Dev All GND'd 0.0131 0.0196 0.0074 0.0274 0.0435 Ps90%/90% (+KTL) All GND'd -0.3944 -0.4323 -0.4095 -0.4575 -0.3696 Ps90%/90% (-KTL) All GND'd -0.4665 -0.5396 -0.4499 -0.6078 -0.6082 Biased-Irradiation Statistics Average Biased -0.4257 -0.4857 -0.4262 -0.5377 -0.4818 Std Dev Biased 0.0309 0.0225 0.0154 0.0290 0.0208 Ps90%/90% (+KTL) Biased -0.3411 -0.4239 -0.3840 -0.4581 -0.4247 Ps90%/90% (-KTL) Biased -0.5104 -0.5474 -0.4685 -0.6173 -0.5389 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 20 20 20 20 20 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 15 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 ΔVout/ΔIout (ppm/mA) (Sinking 0≤Iout≤10mA) 100 Specification MAX 90 80 Ps90%/90% (+KTL) All GND'd 70 Ps90%/90% (+KTL) Biased 60 50 Average Biased 40 Average All GND'd 30 20 Ps90%/90% (-KTL) Biased 10 Ps90%/90% (-KTL) All GND'd 0 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.6: Plot of Load Regulation (Sinking 0 ≤ IOUT ≤ 10mA) versus Total Dose The maximum limits at different post-irradiation doses of the parameter are at 100 ppm/mA and the measured values are in the 2-4 ppm/mA range. P a g e 16 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.6: Raw data for load regulation sinking (ppm/mA) with 0 ≤ IOUT ≤ 10mA versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Total Dose (Krad(Si)) at 10 mrads(Si)/second Parameter ΔVO/ΔIO (Sink 0 ≤ IOUT ≤10mA) Unit # (ppm/mA) 0 10 22 50 100 334 All GND'd Irradiation 2.5426 2.7659 2.6134 3.9620 2.9421 336 All GND'd Irradiation 2.6641 2.7422 2.7840 4.0659 2.7917 337 All GND'd Irradiation 2.5986 2.7019 2.6149 4.0040 2.6503 338 All GND'd Irradiation 2.5736 2.6365 2.6299 3.9494 2.6708 339 All GND'd Irradiation 2.5265 2.6028 2.6977 3.9316 2.6503 340 Biased-Irradiation 2.4537 2.5697 2.5080 3.8931 2.6783 341 Biased-Irradiation 2.6606 2.6686 2.6670 4.0316 2.7289 342 Biased-Irradiation 2.6946 2.8112 2.7427 4.1286 2.8077 343 Biased-Irradiation 2.6740 2.8124 2.7492 4.0392 2.7847 345 Biased-Irradiation 2.7489 2.8600 2.9540 4.0940 2.8902 323 Control Unit 2.7372 2.9356 2.8347 4.1586 2.7995 324 Control Unit 2.5753 2.5556 2.3886 4.0987 2.6555 All GND'd Irradiation Statistics Average All GND'd 2.5811 2.6899 2.6680 3.9826 2.7411 Std Dev All GND'd 0.0541 0.0691 0.0734 0.0536 0.1269 Ps90%/90% (+KTL) All GND'd 2.7294 2.8793 2.8694 4.1297 3.0890 Ps90%/90% (-KTL) All GND'd 2.4327 2.5004 2.4666 3.8355 2.3931 Biased-Irradiation Statistics Average Biased 2.6463 2.7444 2.7242 4.0373 2.7780 Std Dev Biased 0.1128 0.1212 0.1611 0.0900 0.0804 Ps90%/90% (+KTL) Biased 2.9558 3.0766 3.1658 4.2840 2.9985 Ps90%/90% (-KTL) Biased 2.3369 2.4121 2.2825 3.7906 2.5574 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 100 100 100 100 100 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 17 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 1.3 Specification MAX 1.2 Ps90%/90% (+KTL) Biased 1.1 Ps90%/90% (+KTL) All GND'd Supply Current (mA) 1 Average Biased 0.9 Average All GND'd 0.8 Ps90%/90% (-KTL) All GND'd 0.7 Ps90%/90% (-KTL) Biased 0.6 0.5 0.4 0 20 40 60 80 100 120 Total Dose (Krad(Si)) Figure 5.7: Plot of Supply Current versus Total Dose The average measured values of 10 samples are within datasheet maximum limits. P a g e 18 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Table 5.7: Raw data table for supply current (mA) versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Parameter IS Total Dose (Krad(Si)) at 10 mrads(Si)/second Unit # (mA) 0 10 22 50 100 334 All GND'd Irradiation 0.8303 0.8198 0.8287 0.8233 0.7914 336 All GND'd Irradiation 0.8493 0.8578 0.8482 0.8431 0.8488 337 All GND'd Irradiation 0.8043 0.8013 0.8169 0.7986 0.7936 338 All GND'd Irradiation 0.8362 0.8438 0.8473 0.8236 0.8321 339 All GND'd Irradiation 0.8394 0.8399 0.8350 0.8314 0.8319 340 Biased-Irradiation 0.8261 0.8262 0.8336 0.8185 0.8125 341 Biased-Irradiation 0.8442 0.8541 0.8529 0.8394 0.8446 342 Biased-Irradiation 0.8545 0.8570 0.8559 0.8441 0.8450 343 Biased-Irradiation 0.8852 0.8857 0.8864 0.8776 0.8795 345 Biased-Irradiation 0.7981 0.8012 0.7865 0.7977 0.7872 323 Control Unit 0.8058 0.7924 0.7948 0.8150 0.8132 324 Control Unit 0.8445 0.8578 0.8762 0.8499 0.8461 All GND'd Irradiation Statistics Average All GND'd 0.8319 0.8325 0.8352 0.8240 0.8196 Std Dev All GND'd 0.0169 0.0221 0.0132 0.0163 0.0257 Ps90%/90% (+KTL) All GND'd 0.8782 0.8931 0.8713 0.8688 0.8899 Ps90%/90% (-KTL) All GND'd 0.7856 0.7719 0.7991 0.7792 0.7492 Biased-Irradiation Statistics Average Biased 0.8416 0.8448 0.8430 0.8355 0.8338 Std Dev Biased 0.0324 0.0322 0.0368 0.0299 0.0352 Ps90%/90% (+KTL) Biased 0.9306 0.9332 0.9441 0.9175 0.9303 Ps90%/90% (-KTL) Biased 0.7527 0.7565 0.7420 0.7535 0.7372 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 1.20 1.20 1.20 1.20 1.20 Status (Measurements) All GND'd PASS PASS PASS PASS PASS Status (Measurements) Biased PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 19 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Appendix A Picture of one among ten samples used in the test. The date code and related identification numbers should be correlated with the provided information in the second page of this report. Figure A1: Top View showing date code Figure A2: Side View showing serial number P a g e 20 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Appendix B Radiation Bias Connection Tables Table B1: Biased Conditions Pin 1 Function NC Connection / Bias NC 2 3 4 5 VIN NC GND TRIM To 15V, 0.1uF decoupling to pin 4 NC To -15V, 0.1uF decoupling to pin 2 NC 6 7 8 VOUT NC NC NC NC NC Table B2: All GND’d Pin 1 Function NC Connection / Bias GND 2 3 4 5 VIN NC GND TRIM GND GND GND GND 6 7 8 VOUT NC NC GND GND GND P a g e 21 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Figure B1: Total Dose Bias Circuit Figure B2: Pin-Out P a g e 22 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Figure B3: Bias Board (top view) Figure B4: Bias Board (bottom view) P a g e 23 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Appendix C P a g e 24 | 25 LINEAR TECHNOLOGY CORPORATION TID LDR RH1021CMH-5 10214210 W10 Appendix D Table D1: Electrical Characteristics of Device-Under-Test * (0 ≤ IOUT ≤ 10mA) P a g e 25 | 25 LINEAR TECHNOLOGY CORPORATION