ELDRS_LDR_RH1021CMH-5_Fab_Lot_10214210.1_W10.pdf

TID LDR RH1021CMH-5 10214210 W10
Total Ionization Dose (TID) Test Results of the
RH1021CMH-5 Precision 5V Reference @ Low Dose
Rate (LDR)
LDR = 10 mrads(Si)/s
22 September 2014
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the Product Engineering and Applications Signal Group
from Linear Technology for their help with the board design and assembly as well as the
data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd
from Defense Microelectronics Activity (DMEA) for the extensive work for board setup
and continuous dosimetry monitoring throughout the ELDRS tests.
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LINEAR TECHNOLOGY CORPORATION
TID LDR RH1021CMH-5 10214210 W10
TID LDR Testing of the RH1021CMH-5 Precision 5V
Reference
Part Type Tested: RH1021-5 Precision 5V Reference
Traceability Information: Fab Lot# 10214210.1; Wafer # 10; Assembly Lot # 697997.1; Date
Code: 1217A. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5
units for unbiased irradiation. Serial numbers 334, 336 to 339 had all pins tied to ground during
irradiation. Serial numbers 340 to 343 and 345 were biased during irradiation. Serial numbers
323 and 324 were used as control. See Appendix B for the radiation bias connection tables.
Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test
increments: pre-irradiation, 10 Krads(Si), 22 Krads(Si), 50 Krads(Si), 100 Krads(Si).
Radiation dose: 10 mrads(Si)/sec.
Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D.
Test Hardware and Software: LTX pre-irradiation test program EQCM10215.02; LTX postirradiation test program ERHC10215.00; Test Board LT1021; Test Setup 04-04-0540.
Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750.
SUMMARY
ALL 10 PARTS PASSED THE ELECTRICAL TEST LIMITS AS
SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION
INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER
REQUEST.
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TID LDR RH1021CMH-5 10214210 W10
1.0
Overview and Background
Among other radiation effects, Total Ionizing Dose (TID) may affect circuits’ electrical
characteristics, causing parametric and/or functional failures in integrated circuits. During
gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge
trapping in the transistors’ dielectrics and interface regions, affecting hence the devices’ basic
features. Such effects warrant testing and monitoring of circuits to TID, after which annealing
and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and
process technology. Hence is the requirement per Condition D (for low-dose rates ranging from
less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 to not exceed the allowed time
from the end of an incremented irradiation and an electrical test to more than one hour.
Additionally, the total time from the end of one incremental irradiation to the start of the next
incremental step should be less than two hours.
2.0
Radiation facility and test equipment
The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in
Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate
of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel
positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain
optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry.
3.0
Test Conditions
The 10 test samples and two control units were electrically tested at 25°C prior to irradiation.
The parts were then placed in a lead/aluminum container and aligned with the radiation source,
Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased
at +/- 15V and other five had all pads grounded. The devices were irradiated up to 100 Krad(Si)
with increments of 10, 22, and 50 Krads(Si). After each irradiation the samples were transported
in dry ice to Linear Technology testing facility. Testing was performed on the two control units to
confirm the operation of the test system prior to the electrical testing of the 12 units (10
irradiated and 2 control).
The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias
must pass the datasheet limits. If any of the measured parameters of these five units do not
meet the required limits then a failure-analysis of the part should be conducted and if valid the
lot will be scrapped.
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TID LDR RH1021CMH-5 10214210 W10
4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations:
-
Output Voltage (V)
Output Voltage Temperature Coefficient (ppm/°C)
Line Regulation with condition 7.2V ≤ VIN ≤ 10V (ppm/V)
Line Regulation with condition 710V ≤ VIN ≤ 40V (ppm/V)
Load Regulation (Sourcing Current) (ppm/mA)
Load Regulation (Sinking Current) (ppm/mA)
Supply Current (Series Mode) (mA)
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
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TID LDR RH1021CMH-5 10214210 W10
5.0
Test Results
All ten samples passed the post-irradiation electrical tests. All measurements of the seven listed
parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can
be calculated by adding to and subtracting from mean the product of standard deviation and the
tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability
distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
However, in most cases, mean and standard deviation are unknown and therefore it is practical
to estimate both of them from a sample. Hence the tolerance limit depends greatly on the
sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a
sample size of 5, can be found from the tabulated table (MIL-HBK814, page 94, table IX-B). The
KTL factor in this report is 2.742.
In the plots, the dotted lines with diamond markers are the average of the measured data points
of five samples irradiated under electrical bias while the dashed lines with X-markers are the
average of measured data points of five units irradiated with all pins tied to ground. The solid
lines with triangle markers are the average of the data points after the calculation of the KTL
statistics on the sample irradiated in the biased setup. The solid lines with square symbols are
the average of the measured points after the application of the KTL statistics on the five samples
irradiated with all pins grounded. The orange solid lines with circle markers are the specification
limits.
The 22 Krads(Si) test limits are using Linear Technology datasheet 20 Krads(Si) specification
limits.
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TID LDR RH1021CMH-5 10214210 W10
5.0200
5.0150
Specification MAX
5.0100
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (+KTL) Biased
Vout (V)
5.0050
Average Biased
5.0000
Average All GND'd
4.9950
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) All GND'd
4.9900
Specification MIN
4.9850
4.9800
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.1 Plot of Output Voltage versus Total Dose
All ten samples passed the output voltage test at each post-irradiation interval. Note the KTL
square and triangle markers are slightly above the pre-irradiation datasheet limits, due to the
small sample population and in this report the sample size is five.
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TID LDR RH1021CMH-5 10214210 W10
Table 5.1: Raw data for Output Voltage (V) versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL) under the orange headers)
Parameter
VOUT
Total Dose (Krad(Si)) at 10 mrads(Si)/second
Unit #
(V)
0
10
22
50
100
334
All GND'd Irradiation
4.9994 5.0006 5.0016 5.0025 5.0045
336
All GND'd Irradiation
5.0018 5.0029 5.0038 5.0049 5.0070
337
All GND'd Irradiation
4.9992 5.0006 5.0015 5.0025 5.0048
338
All GND'd Irradiation
5.0020 5.0033 5.0043 5.0057 5.0081
339
All GND'd Irradiation
4.9998 5.0009 5.0019 5.0030 5.0052
340
Biased-Irradiation
4.9995 5.0012 5.0025 5.0035 5.0046
341
Biased-Irradiation
5.0020 5.0037 5.0047 5.0059 5.0069
342
Biased-Irradiation
5.0021 5.0036 5.0046 5.0056 5.0065
343
Biased-Irradiation
5.0016 5.0030 5.0040 5.0050 5.0058
345
Biased-Irradiation
5.0020 5.0036 5.0049 5.0058 5.0067
323
Control Unit
5.0020 5.0022 5.0024 5.0024 5.0021
324
Control Unit
4.9997 5.0000 5.0003 5.0001 5.0000
All GND'd Irradiation Statistics
Average All GND'd
5.0005 5.0017 5.0026 5.0037 5.0059
Std Dev All GND'd
0.0013 0.0013 0.0013 0.0015 0.0015
Ps90%/90% (+KTL) All GND'd
5.0041 5.0053 5.0062 5.0078 5.0101
Ps90%/90% (-KTL) All GND'd
4.9968 4.9980 4.9990 4.9997 5.0017
Biased-Irradiation Statistics
Average Biased
5.0014 5.0030 5.0041 5.0052 5.0061
Std Dev Biased
0.0011 0.0010 0.0010 0.0010 0.0009
Ps90%/90% (+KTL) Biased
5.0045 5.0058 5.0069 5.0079 5.0086
Ps90%/90% (-KTL) Biased
4.9984 5.0002 5.0014 5.0024 5.0036
Specification MIN
4.9975 4.9945
4.993
4.991
4.9875
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Specification MAX
5.0025 5.0055
5.007
5.009
5.0125
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
Status (-KTL) Biased
Status (+KTL) Biased
FAIL
FAIL
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
FAIL
PASS
FAIL
PASS
PASS
PASS
PASS
PASS
PASS
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TID LDR RH1021CMH-5 10214210 W10
TCVout (ppm/C)
30
25
Specification MAX
20
Ps90%/90% (+KTL) All GND'd
15
Ps90%/90% (+KTL) Biased
10
Average Biased
5
Average All GND'd
0
Ps90%/90% (-KTL) Biased
-5
Ps90%/90% (-KTL) All GND'd
-10
-15
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.2: Plot of Output Voltage Temperature Coefficient versus Total Dose
The measured values of 10 samples are under datasheet maximum limits.
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Table 5.2: Raw data for voltage output temperature coefficient (ppm/°C) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL under the second orange header)
Parameter
TCVOUT
Total Dose (Krad(Si)) at 10 mrads(Si)/second
Unit #
(ppm/°C)
0
10
22
50
100
334
All GND'd Irradiation
-1.6391 -4.9296 -4.1018 -3.4510 -2.9935
336
All GND'd Irradiation
1.8819 -0.0549 0.0039 0.6234 0.8329
337
All GND'd Irradiation
-1.3206 -4.1598 -2.7175 -3.2128 -3.5509
338
All GND'd Irradiation
2.5956 0.6843 1.3854 1.5338 1.7228
339
All GND'd Irradiation
-0.7640 -2.1650 -2.1863 -2.4756 -1.5167
340
Biased-Irradiation
-0.7821 -2.7760 -1.7327 -1.0056 -2.0894
341
Biased-Irradiation
0.3353 -1.2078 -0.8351 -0.8782 -0.4610
342
Biased-Irradiation
1.4513 -0.3386 0.4685 0.5555 0.4765
343
Biased-Irradiation
1.0354 -0.5338 0.1730 0.5750 -0.0314
345
Biased-Irradiation
2.7456 0.6776 1.2738 2.5791 1.5271
323
Control Unit
-0.1213 -1.2028 -1.2154 -1.5884 -1.4586
324
Control Unit
-1.9747 -3.3525 -3.1274 -3.6538 -4.0282
All GND'd Irradiation Statistics
Average All GND'd
0.1508 -2.1250 -1.5233 -1.3964 -1.1011
Std Dev All GND'd
1.9480 2.4589 2.1970 2.3104 2.3168
Ps90%/90% (+KTL) All GND'd
5.4922 4.6174 4.5009 4.9386 5.2515
Ps90%/90% (-KTL) All GND'd
-5.1907 -8.8674 -7.5474 -7.7314 -7.4538
Biased-Irradiation Statistics
Average Biased
0.9571 -0.8357 -0.1305 0.3651 -0.1157
Std Dev Biased
1.3096 1.2779 1.1712 1.4497 1.3296
Ps90%/90% (+KTL) Biased
4.5481 2.6681 3.0809 4.3404 3.5301
Ps90%/90% (-KTL) Biased
-2.6339 -4.3396 -3.3419 -3.6101 -3.7614
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
20
20
20
20
25
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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15
Specification MAX
ΔVout/ΔVin (ppm/V) (7.2V≤VIN≤10V)
13
Ps90%/90% (+KTL) All
GND'd
11
Average All GND'd
9
Ps90%/90% (-KTL) All GND'd
7
5
Ps90%/90% (+KTL) Biased
3
Average Biased
1
Ps90%/90% (-KTL) Biased
-1
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.3: Plot of Line Regulation (7.2V ≤ VIN ≤ 10V) versus Total Dose
All measured data points are lower than the datasheet specification maximum.
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Table 5.3: Raw data for line regulation (ppm/V) with 7.2V ≤ VIN ≤ 10V versus total dose including
the statistical calculations, minimum specification, maximum specification, and the status of the
test (PASS/FAIL).
Parameter ΔVOUT/ΔVIN (7.2V≤VIN≤10V)
Total Dose (Krad(Si)) at 10 mrads(Si)/second
Unit #
(ppm/V)
0
10
22
50
100
334
All GND'd Irradiation
-0.0058 0.0290 0.0315 0.0253 0.0964
336
All GND'd Irradiation
0.0036 0.0199 0.0276 0.0343 0.0975
337
All GND'd Irradiation
-0.0013 0.0156 0.0280 0.0250 0.0922
338
All GND'd Irradiation
0.0047 0.0168 0.0342 0.0425 0.0948
339
All GND'd Irradiation
0.0025 0.0037 0.0135 0.0498 0.0916
340
Biased-Irradiation
-0.0017 0.0124 0.0133 0.0589 0.0538
341
Biased-Irradiation
0.0027 0.0027 0.0238 0.0438 0.0503
342
Biased-Irradiation
0.0018 0.0126 0.0167 0.0611 0.0561
343
Biased-Irradiation
0.0014 0.0144 0.0171 0.0556 0.0528
345
Biased-Irradiation
0.0065 0.0085 0.0135 0.0064 0.0620
323
Control Unit
0.0080 0.0045 0.0081 0.0245 0.0036
324
Control Unit
0.0000 -0.0014 -0.0127 0.0152 -0.0066
All GND'd Irradiation Statistics
Average All GND'd
0.0008 0.0170 0.0270 0.0354 0.0945
Std Dev All GND'd
0.0043 0.0091 0.0080 0.0108 0.0025
Ps90%/90% (+KTL) All GND'd
0.0125 0.0420 0.0489 0.0651 0.1014
Ps90%/90% (-KTL) All GND'd
-0.0110 -0.0080 0.0050 0.0057 0.0875
Biased-Irradiation Statistics
Average Biased
0.0021 0.0101 0.0169 0.0452 0.0550
Std Dev Biased
0.0029 0.0047 0.0043 0.0227 0.0044
Ps90%/90% (+KTL) Biased
0.0102 0.0229 0.0286 0.1073 0.0671
Ps90%/90% (-KTL) Biased
-0.0059 -0.0027 0.0052 -0.0170 0.0429
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
12
12
12
14
15
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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15
ΔVout/ΔVin (ppm/V) (10V≤VIN≤40V)
13
11
Specification MAX
9
Ps90%/90% (+KTL) All GND'd
7
Average All GND'd
5
Ps90%/90% (-KTL) All GND'd
3
Ps90%/90% (+KTL) Biased
Average Biased
1
Ps90%/90% (-KTL) Biased
-1
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.4: Plot of Line Regulation (10V ≤ VIN ≤ 40V) versus Total Dose
All measured data points are well under datasheet upper limits.
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Table 5.4: Raw data for line regulation (ppm/V) with 10V ≤ VIN ≤ 40V versus total dose including
the statistical calculations, minimum specification, maximum specification, and the status of the
test (PASS/FAIL).
Parameter ΔVOUT/ΔVIN (10V≤VIN≤40V)
Total Dose (Krad(Si)) at 10 mrads(Si)/second
Unit #
(ppm/V)
0
10
22
50
100
334
All GND'd Irradiation
-0.0157 0.0086 0.0381 0.1333 0.2017
336
All GND'd Irradiation
-0.0180 0.0106 0.0295 0.0825 0.2038
337
All GND'd Irradiation
-0.0110 0.0091 0.0471 0.0759 0.2070
338
All GND'd Irradiation
-0.0074 0.0165 0.0667 0.1140 0.2161
339
All GND'd Irradiation
-0.0130 0.0078 0.0316 0.0667 0.1759
340
Biased-Irradiation
0.0512 0.0485 0.0819 0.0861 0.1062
341
Biased-Irradiation
-0.0129 0.0104 0.0413 0.0715 0.1174
342
Biased-Irradiation
-0.0139 0.0041 0.0370 0.0714 0.1048
343
Biased-Irradiation
-0.0117 0.0009 0.0486 0.0655 0.1094
345
Biased-Irradiation
-0.0105 0.0103 0.0516 0.0539 0.1065
323
Control Unit
-0.0132 -0.0159 -0.0286 -0.0361 -0.0078
324
Control Unit
-0.0119 -0.0180 -0.0083 -0.0061 -0.0089
All GND'd Irradiation Statistics
Average All GND'd
-0.0130 0.0105 0.0426 0.0945 0.2009
Std Dev All GND'd
0.0041 0.0035 0.0151 0.0281 0.0150
Ps90%/90% (+KTL) All GND'd
-0.0018 0.0201 0.0840 0.1715 0.2421
Ps90%/90% (-KTL) All GND'd
-0.0243 0.0009 0.0012 0.0175 0.1597
Biased-Irradiation Statistics
Average Biased
0.0005 0.0148 0.0521 0.0697 0.1089
Std Dev Biased
0.0284 0.0192 0.0176 0.0116 0.0051
Ps90%/90% (+KTL) Biased
0.0784 0.0676 0.1005 0.1016 0.1227
Ps90%/90% (-KTL) Biased
-0.0774 -0.0379 0.0037 0.0378 0.0950
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
6
6
6
6
7
Staus (Measurements) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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ΔVout/ΔIout (ppm/mA) (Sourcing
0≤Iout≤10mA)
TID LDR RH1021CMH-5 10214210 W10
20
19
18
17
16
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
-1
Specification MAX
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (+KTL) Biased
Average Biased
Average All GND'd
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) All GND'd
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.5: Plot of Load Regulation (Sourcing 0 ≤ IOUT ≤ 10mA) versus Total Dose
The measured parameters are well under the specification maximum limits.
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Table 5.5: Raw data for load regulation sourcing (ppm/mA) with 0 ≤ IOUT ≤ 10mA versus total
dose including the statistical calculations, minimum specification, maximum specification, and
the status of the test (PASS/FAIL)
Parameter ΔVO/ΔIO (Source 0 ≤IOUT ≤ 10mA) Total Dose (Krad(Si)) at 10 mrads(Si)/second
Unit #
(ppm/mA)
0
10
22
50
100
334
All GND'd Irradiation
-0.4495 -0.5088 -0.4300 -0.5064 -0.5530
336
All GND'd Irradiation
-0.4159 -0.4640 -0.4201 -0.5439 -0.5005
337
All GND'd Irradiation
-0.4304 -0.4872 -0.4263 -0.5584 -0.4351
338
All GND'd Irradiation
-0.4210 -0.5011 -0.4320 -0.5002 -0.4682
339
All GND'd Irradiation
-0.4353 -0.4687 -0.4401 -0.5545 -0.4877
340
Biased-Irradiation
-0.4519 -0.5164 -0.4493 -0.5695 -0.5123
341
Biased-Irradiation
-0.4303 -0.4825 -0.4174 -0.4947 -0.4822
342
Biased-Irradiation
-0.4142 -0.4849 -0.4104 -0.5462 -0.4748
343
Biased-Irradiation
-0.4534 -0.4912 -0.4204 -0.5538 -0.4852
345
Biased-Irradiation
-0.3788 -0.4533 -0.4336 -0.5243 -0.4545
323
Control Unit
-0.4323 -0.5053 -0.3868 -0.5046 -0.4788
324
Control Unit
-0.4068 -0.4560 -0.3515 -0.4675 -0.4661
All GND'd Irradiation Statistics
Average All GND'd
-0.4304 -0.4860 -0.4297 -0.5327 -0.4889
Std Dev All GND'd
0.0131 0.0196 0.0074 0.0274 0.0435
Ps90%/90% (+KTL) All GND'd
-0.3944 -0.4323 -0.4095 -0.4575 -0.3696
Ps90%/90% (-KTL) All GND'd
-0.4665 -0.5396 -0.4499 -0.6078 -0.6082
Biased-Irradiation Statistics
Average Biased
-0.4257 -0.4857 -0.4262 -0.5377 -0.4818
Std Dev Biased
0.0309 0.0225 0.0154 0.0290 0.0208
Ps90%/90% (+KTL) Biased
-0.3411 -0.4239 -0.3840 -0.4581 -0.4247
Ps90%/90% (-KTL) Biased
-0.5104 -0.5474 -0.4685 -0.6173 -0.5389
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
20
20
20
20
20
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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ΔVout/ΔIout (ppm/mA) (Sinking
0≤Iout≤10mA)
100
Specification MAX
90
80
Ps90%/90% (+KTL) All GND'd
70
Ps90%/90% (+KTL) Biased
60
50
Average Biased
40
Average All GND'd
30
20
Ps90%/90% (-KTL) Biased
10
Ps90%/90% (-KTL) All GND'd
0
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.6: Plot of Load Regulation (Sinking 0 ≤ IOUT ≤ 10mA) versus Total Dose
The maximum limits at different post-irradiation doses of the parameter are at 100 ppm/mA and
the measured values are in the 2-4 ppm/mA range.
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Table 5.6: Raw data for load regulation sinking (ppm/mA) with 0 ≤ IOUT ≤ 10mA versus total dose
including the statistical calculations, minimum specification, maximum specification, and the
status of the test (PASS/FAIL)
Total Dose (Krad(Si)) at 10 mrads(Si)/second
Parameter ΔVO/ΔIO (Sink 0 ≤ IOUT ≤10mA)
Unit #
(ppm/mA)
0
10
22
50
100
334
All GND'd Irradiation
2.5426 2.7659 2.6134 3.9620 2.9421
336
All GND'd Irradiation
2.6641 2.7422 2.7840 4.0659 2.7917
337
All GND'd Irradiation
2.5986 2.7019 2.6149 4.0040 2.6503
338
All GND'd Irradiation
2.5736 2.6365 2.6299 3.9494 2.6708
339
All GND'd Irradiation
2.5265 2.6028 2.6977 3.9316 2.6503
340
Biased-Irradiation
2.4537 2.5697 2.5080 3.8931 2.6783
341
Biased-Irradiation
2.6606 2.6686 2.6670 4.0316 2.7289
342
Biased-Irradiation
2.6946 2.8112 2.7427 4.1286 2.8077
343
Biased-Irradiation
2.6740 2.8124 2.7492 4.0392 2.7847
345
Biased-Irradiation
2.7489 2.8600 2.9540 4.0940 2.8902
323
Control Unit
2.7372 2.9356 2.8347 4.1586 2.7995
324
Control Unit
2.5753 2.5556 2.3886 4.0987 2.6555
All GND'd Irradiation Statistics
Average All GND'd
2.5811 2.6899 2.6680 3.9826 2.7411
Std Dev All GND'd
0.0541 0.0691 0.0734 0.0536 0.1269
Ps90%/90% (+KTL) All GND'd
2.7294 2.8793 2.8694 4.1297 3.0890
Ps90%/90% (-KTL) All GND'd
2.4327 2.5004 2.4666 3.8355 2.3931
Biased-Irradiation Statistics
Average Biased
2.6463 2.7444 2.7242 4.0373 2.7780
Std Dev Biased
0.1128 0.1212 0.1611 0.0900 0.0804
Ps90%/90% (+KTL) Biased
2.9558 3.0766 3.1658 4.2840 2.9985
Ps90%/90% (-KTL) Biased
2.3369 2.4121 2.2825 3.7906 2.5574
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
100
100
100
100
100
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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TID LDR RH1021CMH-5 10214210 W10
1.3
Specification MAX
1.2
Ps90%/90% (+KTL) Biased
1.1
Ps90%/90% (+KTL) All GND'd
Supply Current (mA)
1
Average Biased
0.9
Average All GND'd
0.8
Ps90%/90% (-KTL) All GND'd
0.7
Ps90%/90% (-KTL) Biased
0.6
0.5
0.4
0
20
40
60
80
100
120
Total Dose (Krad(Si))
Figure 5.7: Plot of Supply Current versus Total Dose
The average measured values of 10 samples are within datasheet maximum limits.
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Table 5.7: Raw data table for supply current (mA) versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL)
Parameter
IS
Total Dose (Krad(Si)) at 10 mrads(Si)/second
Unit #
(mA)
0
10
22
50
100
334
All GND'd Irradiation
0.8303 0.8198 0.8287 0.8233 0.7914
336
All GND'd Irradiation
0.8493 0.8578 0.8482 0.8431 0.8488
337
All GND'd Irradiation
0.8043 0.8013 0.8169 0.7986 0.7936
338
All GND'd Irradiation
0.8362 0.8438 0.8473 0.8236 0.8321
339
All GND'd Irradiation
0.8394 0.8399 0.8350 0.8314 0.8319
340
Biased-Irradiation
0.8261 0.8262 0.8336 0.8185 0.8125
341
Biased-Irradiation
0.8442 0.8541 0.8529 0.8394 0.8446
342
Biased-Irradiation
0.8545 0.8570 0.8559 0.8441 0.8450
343
Biased-Irradiation
0.8852 0.8857 0.8864 0.8776 0.8795
345
Biased-Irradiation
0.7981 0.8012 0.7865 0.7977 0.7872
323
Control Unit
0.8058 0.7924 0.7948 0.8150 0.8132
324
Control Unit
0.8445 0.8578 0.8762 0.8499 0.8461
All GND'd Irradiation Statistics
Average All GND'd
0.8319 0.8325 0.8352 0.8240 0.8196
Std Dev All GND'd
0.0169 0.0221 0.0132 0.0163 0.0257
Ps90%/90% (+KTL) All GND'd
0.8782 0.8931 0.8713 0.8688 0.8899
Ps90%/90% (-KTL) All GND'd
0.7856 0.7719 0.7991 0.7792 0.7492
Biased-Irradiation Statistics
Average Biased
0.8416 0.8448 0.8430 0.8355 0.8338
Std Dev Biased
0.0324 0.0322 0.0368 0.0299 0.0352
Ps90%/90% (+KTL) Biased
0.9306 0.9332 0.9441 0.9175 0.9303
Ps90%/90% (-KTL) Biased
0.7527 0.7565 0.7420 0.7535 0.7372
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
1.20
1.20
1.20
1.20
1.20
Status (Measurements) All GND'd PASS
PASS
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
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TID LDR RH1021CMH-5 10214210 W10
Appendix A
Picture of one among ten samples used in the test. The date code and related identification
numbers should be correlated with the provided information in the second page of this report.
Figure A1: Top View showing date code
Figure A2: Side View showing serial number
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TID LDR RH1021CMH-5 10214210 W10
Appendix B
Radiation Bias Connection Tables
Table B1: Biased Conditions
Pin
1
Function
NC
Connection / Bias
NC
2
3
4
5
VIN
NC
GND
TRIM
To 15V, 0.1uF decoupling to pin 4
NC
To -15V, 0.1uF decoupling to pin 2
NC
6
7
8
VOUT
NC
NC
NC
NC
NC
Table B2: All GND’d
Pin
1
Function
NC
Connection / Bias
GND
2
3
4
5
VIN
NC
GND
TRIM
GND
GND
GND
GND
6
7
8
VOUT
NC
NC
GND
GND
GND
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Figure B1: Total Dose Bias Circuit
Figure B2: Pin-Out
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TID LDR RH1021CMH-5 10214210 W10
Figure B3: Bias Board (top view)
Figure B4: Bias Board (bottom view)
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Appendix C
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Appendix D
Table D1: Electrical Characteristics of Device-Under-Test
*
(0 ≤ IOUT ≤ 10mA)
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