DDD_RH1028MW_Fab_Lot_W1117814_1_W2.pdf

DDD RH1028MW W1117814.1 W2
Neutron Irradiation Test Results of the RH1028MW
Ultralow Noise Precision High Speed Operational
Amplifiers
20 February 2015
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the Signal Conditioning Product Engineering Group
from Linear Technology for the data collection pre- and post-irradiations. Special thanks
are also for Thomas Regan from University of Massachusetts, Lowell (UMASS) for the
help with the neutrons irradiation tests.
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LINEAR TECHNOLOGY CORPORATION
DDD RH1028MW W1117814.1 W2
Neutron Radiation Test Results of the RH1028MW
Ultralow Noise Precision High Speed Operational
Amplifiers
Part Type Tested: RH1028MW Ultralow Noise Precision High Speed Operational Amplifier
Traceability Information: Fab Lot# W1117814.1; Wafer # 2; Assembly Lot # 675616.3; Date
Code 1228A. See photograph of unit under test in Appendix A.
Quantity of Units: 7 units received, 2 units for control, and 5 units for unbiased irradiation.
Serial numbers 28-29 and 32-34 were placed in an anti-static foam during irradiation. Serial
numbers 35 and 36 were used as control. See Appendix B for the radiation bias connection
tables.
Radiation Dose: Total fluence of 1E12 neutron/cm2.
Radiation Test Standard: MIL-STD-883 TM1017 and Linear Technology RH1028, Spec No.
05-08-5217.
Test Hardware and Software: LTX test program EQBRH1028.02
Facility and Radiation Source: University of Massachusetts, Lowell and Reactor Facility-FNI.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750.
SUMMARY
ALL FIVE PARTS PASSED THE ELECTRICAL TEST LIMITS AS
SPECIFIED IN THE DATASHEET AFTER IRRADIATION TO 1E12 N/cm2.
ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST.
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1.0
Overview and Background
Neutron particles incident on semiconductor materials lose energy along their paths. The energy
loss produces electron-hole pairs (ionization) and displaces atoms in the material lattice
(displacement damage defects or DDD). DDD induces a mixture of isolated and clustered
defects or broken bonds. Such defects elevate the energy level of the material and
consequently change material and electrical properties. The altering energy level creates the
combination of any of the following processes, thermal generation of electron-hole pairs,
recombination, trapping, compensation, tunneling, affecting hence the devices’ basic features.
Bipolar technology is susceptible to neutron displacement damage around a fluence level of
1E12 neutron/cm2. The neutron radiation test for the RH1028MW determines the change in
device performance as a function of neutrons’ fluence.
2.0
Radiation Facility:
Five samples were irradiated unbiased at the University of Massachusetts, Lowell, using the
Reactor Facility-FNI. The neutron flux was determined by system S/P-32, method ASTM E-265,
to be 4.05E9 N/cm2-s (1MeV equivalent) for each irradiation step. Refer to Appendix C for the
certificate of dosimetry.
3.0
Test Conditions
Five samples and two control units were electrically tested at 25°C prior to irradiation. The
testing was performed on the two control units to confirm the operation of the test system prior
to the electrical testing of the 7 units (5 irradiated and 2 control). During irradiation, devices were
placed into an anti-static bag. Devices were then vertically aligned with the radiation source.
The criteria to pass the neutron displacement damage test is that five irradiated samples must
pass the datasheet limits. If any of the tested parameters of these five units do not meet the
required limits then a failure-analysis of the part should be conducted in accordance with
method 5004, MIL-STD-883, and if valid the lot will be scrapped.
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4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations at VS = +/- 15V, VCM = 0V
unless otherwise noted:
-
Input Offset Voltage VOS (uV)
Input Offset Current IOS (nA)
Positive Bias Current + IB (nA)
Negative Bias Current – IB (nA)
Positive Slew Rate +SR (V/uS)
Negative Slew Rate –SR (V/uS)
Common Mode Rejection Ratio CMRR (dB)
Power Supply Rejection Ratio PSRR (dB)
Large-Signal Voltage Gain AVOL (V/uV)
Positive Output Voltage Swing (V) at RL = 2KΩ
Negative Output Voltage Swing (V) at RL = 2KΩ
Positive Output Voltage Swing (V) at RL = 600Ω
Negative Output Voltage Swing (V) at RL = 600Ω
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
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5.0
Test Results
All five samples passed the post-irradiation electrical tests. All measurements of the thirteen
listed parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can
be calculated as follows:
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
Where +KTL is the upper tolerance limit and -KTL is the lower tolerance limit.
These tolerance limits are defined in a table of inverse normal probability distribution.
However, in most cases, mean and standard deviations are unknown and therefore it is
practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on
the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a
sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B).
The KTL factor in this report is 2.742.
In the plots, the dashed lines with X-markers are the measured data points of five postirradiated samples. The solid lines with square symbols are the computed KTL values of five
post-irradiated samples with the application of the KTL statistics. The orange solid lines with
circle markers are the datasheet specification limits.
The post-irradiation test limits are using Linear Technology datasheets 100 Krads(Si)
specification limits.
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200
Specification MAX
Vos (uV) @ +/- 15V
150
100
Ps90%/90% (+KTL) Unbiased
50
Average Unbiased
0
Ps90%/90% (-KTL) Unbiased
-50
-100
0
5E+11
1E+12
1.5E+12
Total Fluences (neutrons/cm2)
Figure 5.1 Plot of Input Voltage Offset VOS versus Total Fluence
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Table 5.1: Raw data table for Input Offset Voltage of pre- and post-irradiation (1E12 N/cm2)
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL).
Parameter
Units
28
29
32
33
34
35
36
VOS +/- 15V
(uV)
Unbiased Irradiation
Unbiased Irradiation
Unbiased Irradiation
Unbiased Irradiation
Unbiased Irradiation
Control Unit
Control Unit
Unbiased Irradiation Statistics
Average Unbiased
Std Dev Unbiased
Ps90%/90% (+KTL) Unbiased
Ps90%/90% (-KTL) Unbiased
Specification MIN
Status (Measurements) Unbiased
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
Total Fluence (N/cm 2)
0
1E+12
-15.92250 -4.15021
-15.80105 -4.25633
22.33511 31.80490
-19.77537 -7.64051
-22.45927 -2.79306
-6.85748 -7.51105
-3.09044 -4.03001
-10.32462 2.59296
18.46992 16.42752
40.31991 47.63722
-60.96914 -42.45130
80
PASS
160
PASS
PASS
PASS
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Input Offset Current (nA) @ +/- 15V
DDD RH1028MW W1117814.1 W2
350.000
300.000
Specification MAX
250.000
200.000
Ps90%/90% (+KTL) Unbiased
150.000
100.000
Average Unbiased
50.000
0.000
-50.000
Ps90%/90% (-KTL) Unbiased
-100.000
-150.000
0
5E+11
1E+12
1.5E+12
Total Fluences (neutrons/cm2)
Figure 5.2: Plot of Input Offset Current IOS versus Total Fluence
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Table 5.2: Raw data table for Input Offset Current at +/- 15V of pre- and post-irradiation (1E12
N/cm2) including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL).
Parameter
Input Offset Current @+/-15V
Total Fluence (N/cm 2)
Units
(nA)
0
1E+12
28 Unbiased Irradiation
3.29649 15.06171
29 Unbiased Irradiation
-16.48244 -40.40946
32 Unbiased Irradiation
23.80797 -7.71453
33 Unbiased Irradiation
9.15691 36.00116
34 Unbiased Irradiation
-7.69181 -15.06171
35 Control Unit
15.74989 15.06171
36 Control Unit
15.74989 13.95963
Unbiased Irradiation Statistics
Average Unbiased
2.41742
-2.42457
Std Dev Unbiased
15.51733 29.20976
Ps90%/90% (+KTL) Unbiased
44.96595 77.66859
Ps90%/90% (-KTL) Unbiased
-40.13110 -82.51772
Specification MIN
Status (Measurements) Unbiased
Specification MAX
150
300
Status (Measurements) Unbiased
PASS
PASS
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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+ Input Bias Current (nA) @ +/- 15V
1500.00
Specification MAX
1000.00
Ps90%/90% (+KTL) Unbiased
500.00
Average Unbiased
0.00
-500.00
Ps90%/90% (-KTL) Unbiased
-1000.00
Specification MIN
-1500.00
0
5E+11
Total Fluences
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.3: Plot of Positive Bias Current versus Total Fluence
Note: the post irradiation +KTL point was marginally higher than the maximum specification limit
due to the small 5-piece sample size.
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Table 5.3: Raw data table for Positive Bias Current of pre- and post-irradiation (1E12 N/cm2)
including the statistical calculations, minimum specification, maximum specification, and the
status of the test (PASS/FAIL).
Parameter Positive Input Bias Current +/-15V Total Fluence (N/cm 2 )
Units
(nA)
0
1E+12
28 Unbiased Irradiation
-252.88510 535.96300
29 Unbiased Irradiation
-117.46330 684.73950
32 Unbiased Irradiation
43.98002 732.31120
33 Unbiased Irradiation
-285.50360 459.00320
34 Unbiased Irradiation
-96.20629 723.67860
35 Control Unit
-176.10330 -172.65440
36 Control Unit
-190.58010 -186.61370
Unbiased Irradiation Statistics
Average Unbiased
-141.61565 627.13910
Std Dev Unbiased
132.45351 122.76157
Ps90%/90% (+KTL) Unbiased
221.57188 963.75133
Ps90%/90% (-KTL) Unbiased
-504.80318 290.52687
Specification MIN
-400
-1100
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
400
1100
Status (Measurements) Unbiased
PASS
PASS
Status (-KTL) Unbiased
Status (+KTL) Unbiased
FAIL
PASS
PASS
PASS
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- Input Bias Current (nA) @ +/- 15V
1500.00
Specification MAX
1000.00
Ps90%/90% (+KTL) Unbiased
500.00
Average Unbiased
0.00
-500.00
Ps90%/90% (-KTL) Unbiased
-1000.00
Specification MIN
-1500.00
0
5E+11
Total Fluences
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.4: Plot of Negative Bias Current versus Total Fluence
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Table 5.4: Raw data table for Positive Bias Current of pre- and post-irradiation (1E12 N/cm2)
including the statistical calculations, minimum specification, maximum specification, and the
status of the test (PASS/FAIL).
Parameter Negative Input Bias Current @+/-15V Total Fluence (N/cm 2)
Units
(nA)
0
1E+12
28 Unbiased Irradiation
-249.95310 549.73860
29 Unbiased Irradiation
-135.78830 642.86180
32 Unbiased Irradiation
68.90201 724.04610
33 Unbiased Irradiation
-270.47710 494.45280
34 Unbiased Irradiation
-103.90280 708.25020
35 Control Unit
-160.16050 -159.24620
36 Control Unit
-177.20280 -172.47070
Unbiased Irradiation Statistics
Average Unbiased
-138.24386 623.86990
Std Dev Unbiased
136.06922 99.69984
Ps90%/90% (+KTL) Unbiased
234.85795 897.24687
Ps90%/90% (-KTL) Unbiased
-511.34567 350.49293
Specification MIN
-400
-1100
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
400
1100
Status (Measurements) Unbiased
PASS
PASS
Status (-KTL) Unbiased
Status (+KTL) Unbiased
FAIL
PASS
PASS
PASS
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17.000
Ps90%/90% (+KTL) Unbiased
+ Slew Rate (V/uS)
15.000
13.000
Average Unbiased
11.000
Ps90%/90% (-KTL) Unbiased
9.000
Specification MIN
7.000
5.000
0
5E+11
1E+12
Total Fluence
(neutrons/cm2)
1.5E+12
Figure 5.5: Plot of Positive Slew Rate versus Total Fluence
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Table 5.5: Raw data table for Positive Slew Rate of pre- and post-irradiation (1E12 N/cm2)
including the statistical calculations, minimum specification, and the status of the test
(PASS/FAIL).
Positive Slew Rate
Parameter
Total Fluence (N/cm 2)
Units
(V/uS)
0
1E+12
28 Unbiased Irradiation
13.98887 13.25790
29 Unbiased Irradiation
14.80586 14.18451
32 Unbiased Irradiation
14.18449 13.61351
33 Unbiased Irradiation
15.25150 14.38572
34 Unbiased Irradiation
14.18449 13.61351
35 Control Unit
15.25150 14.80588
36 Control Unit
15.48460 15.02538
Unbiased Irradiation Statistics
Average Unbiased
14.48304 13.81103
Std Dev Unbiased
0.52849
0.46199
Ps90%/90% (+KTL) Unbiased
15.93216 15.07781
Ps90%/90% (-KTL) Unbiased
13.03392 12.54425
Specification MIN
11.0
7.5
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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17.000
Ps90%/90% (+KTL) Unbiased
- Slew Rate (V/uS)
15.000
13.000
Average Unbiased
11.000
Ps90%/90% (-KTL) Unbiased
9.000
Specification MIN
7.000
5.000
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.6: Plot of Negative Slew Rate versus Total Fluence
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Table 5.6: Raw data table for Negative Slew Rate of pre- and post-irradiation (1E12 N/cm2)
including the statistical calculations, minimum specification, and the status of the test
(PASS/FAIL).
Negative Slew Rate
Parameter
Total Fluence (N/cm 2)
Units
(V/uS)
0
1E+12
28 Unbiased Irradiation
14.08887 13.53333
29 Unbiased Irradiation
14.90586 14.28451
32 Unbiased Irradiation
14.28449 13.89863
33 Unbiased Irradiation
15.12535 14.48572
34 Unbiased Irradiation
14.28449 13.89863
35 Control Unit
14.90586 15.12537
36 Control Unit
15.35149 15.12537
Unbiased Irradiation Statistics
Average Unbiased
14.53781 14.02016
Std Dev Unbiased
0.45015
0.37188
Ps90%/90% (+KTL) Unbiased
15.77213 15.03985
Ps90%/90% (-KTL) Unbiased
13.30349 13.00048
Specification MIN
11.0
7.5
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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CMMR (dB) @ +/- 15V
130.000
125.000
Ps90%/90% (+KTL) Unbiased
120.000
Average Unbiased
115.000
Ps90%/90% (-KTL) Unbiased
110.000
Specification MIN
105.000
0
5E+11
1E+12
1.5E+12
Total Fluence (neutrons/cm2)
Figure 5.7: Plot of Common Mode Rejection Rate versus Total Fluence
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Table 5.7: Raw data table for Common Mode Rejection Rate of pre- and post-irradiation (1E12
N/cm2) including the statistical calculations, minimum specification, and the status of the test
(PASS/FAIL).
CMRR @+/-15V; CMR @+/-11.V Total Fluence (N/cm 2)
Parameter
Units
(dB)
0
1E+12
28 Unbiased Irradiation
123.9118 123.3559
29 Unbiased Irradiation
122.6815 121.7427
32 Unbiased Irradiation
124.1027 122.8397
33 Unbiased Irradiation
123.7250 122.5119
34 Unbiased Irradiation
122.3597 121.3119
35 Control Unit
123.5422 123.3559
36 Control Unit
123.0156 123.3559
Unbiased Irradiation Statistics
Average Unbiased
123.3561 122.3524
Std Dev Unbiased
0.7827
0.8253
Ps90%/90% (+KTL) Unbiased
125.5022 124.6153
Ps90%/90% (-KTL) Unbiased
121.2101 120.0895
Specification MIN
110
106
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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150.000
PSSR (dB) @ +/- 4V to +/- 18V
Ps90%/90% (+KTL) Unbiased
140.000
130.000
Average Unbiased
120.000
Ps90%/90% (-KTL) Unbiased
110.000
Specification MIN
100.000
90.000
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.8: Plot of Power Supply Rejection Rate versus Total Fluence
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Table 5.8: Raw data table for Power Supply Rejection Rate of pre- and post-irradiation (1E12
N/cm2) including the statistical calculations, minimum specification, and the status of the test
(PASS/FAIL).
PSRR,+/-4 TO +/-18
Parameter
Total Fluence (N/cm 2)
Units
(dB)
0
1E+12
28 Unbiased Irradiation
131.5675 140.9254
29 Unbiased Irradiation
129.2955 136.1023
32 Unbiased Irradiation
129.5757 135.6606
33 Unbiased Irradiation
130.3574 137.0595
34 Unbiased Irradiation
129.1587 136.4098
35 Control Unit
130.1268 130.7080
36 Control Unit
130.4750 130.2341
Unbiased Irradiation Statistics
Average Unbiased
129.9910 137.2315
Std Dev Unbiased
0.9961
2.1268
Ps90%/90% (+KTL) Unbiased
132.7221 143.0631
Ps90%/90% (-KTL) Unbiased
127.2598 131.3999
Specification MIN
110
104
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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AVol (VuV) @ +/- 15V, Rl = 2KΩ
1000.00
800.00
Ps90%/90% (+KTL) Unbiased
600.00
400.00
Average Unbiased
200.00
0.00
Specification MIN
-200.00
-400.00
Ps90%/90% (-KTL) Unbiased
-600.00
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.9: Plot of Large Signal Voltage Gain versus Total Fluence
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Table 5.9: Raw data table for Large Signal Voltage Gain of pre- and post-irradiation (1E12
N/cm2) including the statistical calculations, minimum specification, and the status of the test
(PASS/FAIL).
Parameter
Units
28
29
32
33
34
35
36
AVOL @+/-15V; VO=-10V TO 10V; RL=2K
(V/uV)
Unbiased Irradiation
Unbiased Irradiation
Unbiased Irradiation
Unbiased Irradiation
Unbiased Irradiation
Control Unit
Control Unit
Unbiased Irradiation Statistics
Average Unbiased
Std Dev Unbiased
Ps90%/90% (+KTL) Unbiased
Ps90%/90% (-KTL) Unbiased
Specification MIN
Status (Measurements) Unbiased
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
Total Fluence (N/cm 2)
0
1E+12
22.53
11.50
32.77
540.27
22.53
15.89
19.31
52.71
37.95
93.96
22.30
33.25
23.51
13.26
27.02
7.94
48.79
5.25
5
PASS
142.87
224.63
758.80
-473.07
2
PASS
PASS
FAIL
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+ Ouput Swing @ +/- 15V, RL =2KΩ
DDD RH1028MW W1117814.1 W2
13.750
Ps90%/90% (+KTL) Unbiased
13.250
Average Unbiased
12.750
12.250
Ps90%/90% (-KTL) Unbiased
11.750
Specification MIN
11.250
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.10: Plot of Positive Output Swing @ RL = 2KΩ versus Total Fluence
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Table 5.10: Raw data table for Positive Output Swing at RL = 2KΩ of pre- and post-irradiation
(1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the
test (PASS/FAIL).
Parameter Pos. Output Swing @+/-15V;R=2K Total Fluence (N/cm 2)
Units
(V)
0
1E+12
28 Unbiased Irradiation
13.54872 13.55609
29 Unbiased Irradiation
13.54727 13.55647
32 Unbiased Irradiation
13.54597 13.55465
33 Unbiased Irradiation
13.54903 13.56182
34 Unbiased Irradiation
13.54475 13.55465
35 Control Unit
13.54300 13.54427
36 Control Unit
13.54300 13.54297
Unbiased Irradiation Statistics
Average Unbiased
13.54715 13.55674
Std Dev Unbiased
0.00181
0.00296
Ps90%/90% (+KTL) Unbiased
13.55212 13.56485
Ps90%/90% (-KTL) Unbiased
13.54217 13.54862
Specification MIN
12.0
11.5
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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- Output Swing (V) @ +/- 15V, Rl = 2KΩ
-11.0
-11.5
Specification MAX
-12.0
Ps90%/90% (+KTL) Unbiased
-12.5
-13.0
Average Unbiased
-13.5
Ps90%/90% (-KTL) Unbiased
-14.0
-14.5
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.11: Plot of Negative Output Swing @ RL = 2KΩ versus Total Fluence
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Table 5.11: Raw data table for Negative Output Swing at RL = 2KΩ of pre- and post-irradiation
(1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the
test (PASS/FAIL).
Parameter - OUTPUT SWING @+/-15V; RL=2K Total Fluence (N/cm 2)
Units
(V)
0
1E+12
28 Unbiased Irradiation
-13.87552 -13.82982
29 Unbiased Irradiation
-13.88651 -13.84446
32 Unbiased Irradiation
-13.87583 -13.82982
33 Unbiased Irradiation
-13.89230 -13.85057
34 Unbiased Irradiation
-13.87568 -13.82928
35 Control Unit
-13.88438 -13.88873
36 Control Unit
-13.88856 -13.89278
Unbiased Irradiation Statistics
Average Unbiased
-13.88117 -13.83679
Std Dev Unbiased
0.00779
0.01003
Ps90%/90% (+KTL) Unbiased
-13.85980 -13.80929
Ps90%/90% (-KTL) Unbiased
-13.90254 -13.86429
Specification MIN
Status (Measurements) Unbiased
Specification MAX
-12.0
-11.5
Status (Measurements) Unbiased
PASS
PASS
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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+ Output Voltage (V) @ +/- 15V, Rl = 600Ω
DDD RH1028MW W1117814.1 W2
12.50000
Ps90%/90% (+KTL) Unbiased
12.00000
11.50000
Average Unbiased
11.00000
Ps90%/90% (-KTL) Unbiased
10.50000
Specification MIN
10.00000
9.50000
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.12: Plot of Positive Output Swing Voltage VOUT with RL = 600Ω versus Total Fluence
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Table 5.12: Raw data table for Positive Output Swing at RL = 600Ω of pre- and post-irradiation
(1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the
test (PASS/FAIL).
Parameter + OUTPUT VOLTAGE @+/-15V; RL=600 Total Fluence (N/cm 2)
Units
V
0
1E+12
28 Unbiased Irradiation
11.90738 11.88852
29 Unbiased Irradiation
11.99483 11.97292
32 Unbiased Irradiation
11.89494 11.85434
33 Unbiased Irradiation
12.00208 11.97032
34 Unbiased Irradiation
11.91470 11.87730
35 Control Unit
11.95882 11.94544
36 Control Unit
12.01300 12.00756
Unbiased Irradiation Statistics
Average Unbiased
11.94279 11.91268
Std Dev Unbiased
0.05137
0.05520
Ps90%/90% (+KTL) Unbiased
12.08365 12.06405
Ps90%/90% (-KTL) Unbiased
11.80193 11.76131
Specification MIN
10.5
10.0
Status (Measurements) Unbiased
PASS
PASS
Specification MAX
Status (Measurements) Unbiased
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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DDD RH1028MW W1117814.1 W2
- Output Swing (V) +/- 15V, RL = 600Ω
-9.000
-9.500
Specification MAX
-10.000
-10.500
Ps90%/90% (+KTL) Unbiased
-11.000
Average Unbiased
-11.500
-12.000
Ps90%/90% (-KTL) Unbiased
-12.500
-13.000
0
5E+11
Total Fluence
1E+12
1.5E+12
(neutrons/cm2)
Figure 5.13: Plot of Negative Output Swing Voltage VOUT with RL = 600Ω versus Total Fluence
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LINEAR TECHNOLOGY CORPORATION
DDD RH1028MW W1117814.1 W2
Table 5.13: Raw data table for Negative Output Swing at RL = 600Ω of pre- and post-irradiation
(1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the
test (PASS/FAIL).
Parameter - OUTPUT SWING @+/-15V; RL=600 Total Fluence (N/cm 2)
Units
(V)
0
1E+12
28 Unbiased Irradiation
-12.20846 -11.99352
29 Unbiased Irradiation
-12.31561 -12.02069
32 Unbiased Irradiation
-12.21532 -11.98162
33 Unbiased Irradiation
-12.33612 -12.03648
34 Unbiased Irradiation
-12.24821 -11.98520
35 Control Unit
-12.29942 -12.29112
36 Control Unit
-12.34957 -12.34728
Unbiased Irradiation Statistics
Average Unbiased
-12.26474 -12.00350
Std Dev Unbiased
0.05824
0.02396
Ps90%/90% (+KTL) Unbiased
-12.10506 -11.93780
Ps90%/90% (-KTL) Unbiased
-12.42443 -12.06920
Specification MIN
Status (Measurements) Unbiased
Specification MAX
-10.5
-10.0
Status (Measurements) Unbiased
PASS
PASS
Status (-KTL) Unbiased
Status (+KTL) Unbiased
PASS
PASS
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DDD RH1028MW W1117814.1 W2
Appendix A
Pictures of one among five samples used in the test.
Figure A1: Top View showing date code
Figure A2: Bottom View showing serial number
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DDD RH1028MW W1117814.1 W2
Appendix B
Radiation Bias Connection Table
Table B1: Unbias condition
Pin
Function
Connection
1
2
3
NC
VOS TRIM
-IN
+IN
VOvercomp
VOUT
V+
VOS TRIM
NC
Float
Float
Float
Float
Float
Float
Float
Float
Float
Float
4
5
6
7
8
9
10
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DDD RH1028MW W1117814.1 W2
Figure B1: Pin-Out
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DDD RH1028MW W1117814.1 W2
Appendix C
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Appendix D
Table D1: Electrical Characteristics of Device-Under-Test
Parameter
Pre-irradiation
MIN
MAX
10 Krad(Si)
MIN
MAX
20 Krad(Si)
MIN
MAX
50 Krad(Si)
MIN
MAX
100 Krad(Si)
MIN
MAX
200 Krad(Si)
MIN
MAX
Units
Input Offset Voltage
80
100
120
140
160
180
uV
Input Offset Current
150
200
200
200
300
500
nA
+ Input Bias Current
+/-400
+/-600
+/-700
+/-950
+/-1100
+/-1700
nA
- Input Bias Current
+/-400
+/-600
+/-700
+/-950
+/-1100
+/-1700
nA
+ Slew Rate
11
7.5
7.5
7.5
7.5
7.5
V/uS
- Slew Rate
11
7.5
7.5
7.5
7.5
7.5
V/uS
CMRR
110
106
106
106
106
106
dB
PSRR
110
104
104
104
104
104
dB
AVOL (RL = 2 KΩ)
5
2
2
2
2
2
VOUT (+) (RL = 2 KΩ)
12
11.5
11.5
11.5
11.5
11.5
VOUT (-) (RL = 2 KΩ)
VOUT (+) (RL = 600 Ω)
VOUT (-) (RL = 600 Ω)
-12
10.5
-11.5
10
-10.5
-11.5
10
-10
-11.5
10
-10
-11.5
10
-10
V/uV
V
-11.5
10
-10
V
V
-10
V
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