DDD RH1028MW W1117814.1 W2 Neutron Irradiation Test Results of the RH1028MW Ultralow Noise Precision High Speed Operational Amplifiers 20 February 2015 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the Signal Conditioning Product Engineering Group from Linear Technology for the data collection pre- and post-irradiations. Special thanks are also for Thomas Regan from University of Massachusetts, Lowell (UMASS) for the help with the neutrons irradiation tests. P a g e 1 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Neutron Radiation Test Results of the RH1028MW Ultralow Noise Precision High Speed Operational Amplifiers Part Type Tested: RH1028MW Ultralow Noise Precision High Speed Operational Amplifier Traceability Information: Fab Lot# W1117814.1; Wafer # 2; Assembly Lot # 675616.3; Date Code 1228A. See photograph of unit under test in Appendix A. Quantity of Units: 7 units received, 2 units for control, and 5 units for unbiased irradiation. Serial numbers 28-29 and 32-34 were placed in an anti-static foam during irradiation. Serial numbers 35 and 36 were used as control. See Appendix B for the radiation bias connection tables. Radiation Dose: Total fluence of 1E12 neutron/cm2. Radiation Test Standard: MIL-STD-883 TM1017 and Linear Technology RH1028, Spec No. 05-08-5217. Test Hardware and Software: LTX test program EQBRH1028.02 Facility and Radiation Source: University of Massachusetts, Lowell and Reactor Facility-FNI. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750. SUMMARY ALL FIVE PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER IRRADIATION TO 1E12 N/cm2. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 1.0 Overview and Background Neutron particles incident on semiconductor materials lose energy along their paths. The energy loss produces electron-hole pairs (ionization) and displaces atoms in the material lattice (displacement damage defects or DDD). DDD induces a mixture of isolated and clustered defects or broken bonds. Such defects elevate the energy level of the material and consequently change material and electrical properties. The altering energy level creates the combination of any of the following processes, thermal generation of electron-hole pairs, recombination, trapping, compensation, tunneling, affecting hence the devices’ basic features. Bipolar technology is susceptible to neutron displacement damage around a fluence level of 1E12 neutron/cm2. The neutron radiation test for the RH1028MW determines the change in device performance as a function of neutrons’ fluence. 2.0 Radiation Facility: Five samples were irradiated unbiased at the University of Massachusetts, Lowell, using the Reactor Facility-FNI. The neutron flux was determined by system S/P-32, method ASTM E-265, to be 4.05E9 N/cm2-s (1MeV equivalent) for each irradiation step. Refer to Appendix C for the certificate of dosimetry. 3.0 Test Conditions Five samples and two control units were electrically tested at 25°C prior to irradiation. The testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 7 units (5 irradiated and 2 control). During irradiation, devices were placed into an anti-static bag. Devices were then vertically aligned with the radiation source. The criteria to pass the neutron displacement damage test is that five irradiated samples must pass the datasheet limits. If any of the tested parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted in accordance with method 5004, MIL-STD-883, and if valid the lot will be scrapped. P a g e 3 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations at VS = +/- 15V, VCM = 0V unless otherwise noted: - Input Offset Voltage VOS (uV) Input Offset Current IOS (nA) Positive Bias Current + IB (nA) Negative Bias Current – IB (nA) Positive Slew Rate +SR (V/uS) Negative Slew Rate –SR (V/uS) Common Mode Rejection Ratio CMRR (dB) Power Supply Rejection Ratio PSRR (dB) Large-Signal Voltage Gain AVOL (V/uV) Positive Output Voltage Swing (V) at RL = 2KΩ Negative Output Voltage Swing (V) at RL = 2KΩ Positive Output Voltage Swing (V) at RL = 600Ω Negative Output Voltage Swing (V) at RL = 600Ω Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 5.0 Test Results All five samples passed the post-irradiation electrical tests. All measurements of the thirteen listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated as follows: +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) Where +KTL is the upper tolerance limit and -KTL is the lower tolerance limit. These tolerance limits are defined in a table of inverse normal probability distribution. However, in most cases, mean and standard deviations are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dashed lines with X-markers are the measured data points of five postirradiated samples. The solid lines with square symbols are the computed KTL values of five post-irradiated samples with the application of the KTL statistics. The orange solid lines with circle markers are the datasheet specification limits. The post-irradiation test limits are using Linear Technology datasheets 100 Krads(Si) specification limits. P a g e 5 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 200 Specification MAX Vos (uV) @ +/- 15V 150 100 Ps90%/90% (+KTL) Unbiased 50 Average Unbiased 0 Ps90%/90% (-KTL) Unbiased -50 -100 0 5E+11 1E+12 1.5E+12 Total Fluences (neutrons/cm2) Figure 5.1 Plot of Input Voltage Offset VOS versus Total Fluence P a g e 6 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.1: Raw data table for Input Offset Voltage of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL). Parameter Units 28 29 32 33 34 35 36 VOS +/- 15V (uV) Unbiased Irradiation Unbiased Irradiation Unbiased Irradiation Unbiased Irradiation Unbiased Irradiation Control Unit Control Unit Unbiased Irradiation Statistics Average Unbiased Std Dev Unbiased Ps90%/90% (+KTL) Unbiased Ps90%/90% (-KTL) Unbiased Specification MIN Status (Measurements) Unbiased Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased Total Fluence (N/cm 2) 0 1E+12 -15.92250 -4.15021 -15.80105 -4.25633 22.33511 31.80490 -19.77537 -7.64051 -22.45927 -2.79306 -6.85748 -7.51105 -3.09044 -4.03001 -10.32462 2.59296 18.46992 16.42752 40.31991 47.63722 -60.96914 -42.45130 80 PASS 160 PASS PASS PASS P a g e 7 | 36 LINEAR TECHNOLOGY CORPORATION Input Offset Current (nA) @ +/- 15V DDD RH1028MW W1117814.1 W2 350.000 300.000 Specification MAX 250.000 200.000 Ps90%/90% (+KTL) Unbiased 150.000 100.000 Average Unbiased 50.000 0.000 -50.000 Ps90%/90% (-KTL) Unbiased -100.000 -150.000 0 5E+11 1E+12 1.5E+12 Total Fluences (neutrons/cm2) Figure 5.2: Plot of Input Offset Current IOS versus Total Fluence P a g e 8 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.2: Raw data table for Input Offset Current at +/- 15V of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL). Parameter Input Offset Current @+/-15V Total Fluence (N/cm 2) Units (nA) 0 1E+12 28 Unbiased Irradiation 3.29649 15.06171 29 Unbiased Irradiation -16.48244 -40.40946 32 Unbiased Irradiation 23.80797 -7.71453 33 Unbiased Irradiation 9.15691 36.00116 34 Unbiased Irradiation -7.69181 -15.06171 35 Control Unit 15.74989 15.06171 36 Control Unit 15.74989 13.95963 Unbiased Irradiation Statistics Average Unbiased 2.41742 -2.42457 Std Dev Unbiased 15.51733 29.20976 Ps90%/90% (+KTL) Unbiased 44.96595 77.66859 Ps90%/90% (-KTL) Unbiased -40.13110 -82.51772 Specification MIN Status (Measurements) Unbiased Specification MAX 150 300 Status (Measurements) Unbiased PASS PASS Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 9 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 + Input Bias Current (nA) @ +/- 15V 1500.00 Specification MAX 1000.00 Ps90%/90% (+KTL) Unbiased 500.00 Average Unbiased 0.00 -500.00 Ps90%/90% (-KTL) Unbiased -1000.00 Specification MIN -1500.00 0 5E+11 Total Fluences 1E+12 1.5E+12 (neutrons/cm2) Figure 5.3: Plot of Positive Bias Current versus Total Fluence Note: the post irradiation +KTL point was marginally higher than the maximum specification limit due to the small 5-piece sample size. P a g e 10 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.3: Raw data table for Positive Bias Current of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Parameter Positive Input Bias Current +/-15V Total Fluence (N/cm 2 ) Units (nA) 0 1E+12 28 Unbiased Irradiation -252.88510 535.96300 29 Unbiased Irradiation -117.46330 684.73950 32 Unbiased Irradiation 43.98002 732.31120 33 Unbiased Irradiation -285.50360 459.00320 34 Unbiased Irradiation -96.20629 723.67860 35 Control Unit -176.10330 -172.65440 36 Control Unit -190.58010 -186.61370 Unbiased Irradiation Statistics Average Unbiased -141.61565 627.13910 Std Dev Unbiased 132.45351 122.76157 Ps90%/90% (+KTL) Unbiased 221.57188 963.75133 Ps90%/90% (-KTL) Unbiased -504.80318 290.52687 Specification MIN -400 -1100 Status (Measurements) Unbiased PASS PASS Specification MAX 400 1100 Status (Measurements) Unbiased PASS PASS Status (-KTL) Unbiased Status (+KTL) Unbiased FAIL PASS PASS PASS P a g e 11 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 - Input Bias Current (nA) @ +/- 15V 1500.00 Specification MAX 1000.00 Ps90%/90% (+KTL) Unbiased 500.00 Average Unbiased 0.00 -500.00 Ps90%/90% (-KTL) Unbiased -1000.00 Specification MIN -1500.00 0 5E+11 Total Fluences 1E+12 1.5E+12 (neutrons/cm2) Figure 5.4: Plot of Negative Bias Current versus Total Fluence P a g e 12 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.4: Raw data table for Positive Bias Current of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Parameter Negative Input Bias Current @+/-15V Total Fluence (N/cm 2) Units (nA) 0 1E+12 28 Unbiased Irradiation -249.95310 549.73860 29 Unbiased Irradiation -135.78830 642.86180 32 Unbiased Irradiation 68.90201 724.04610 33 Unbiased Irradiation -270.47710 494.45280 34 Unbiased Irradiation -103.90280 708.25020 35 Control Unit -160.16050 -159.24620 36 Control Unit -177.20280 -172.47070 Unbiased Irradiation Statistics Average Unbiased -138.24386 623.86990 Std Dev Unbiased 136.06922 99.69984 Ps90%/90% (+KTL) Unbiased 234.85795 897.24687 Ps90%/90% (-KTL) Unbiased -511.34567 350.49293 Specification MIN -400 -1100 Status (Measurements) Unbiased PASS PASS Specification MAX 400 1100 Status (Measurements) Unbiased PASS PASS Status (-KTL) Unbiased Status (+KTL) Unbiased FAIL PASS PASS PASS P a g e 13 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 17.000 Ps90%/90% (+KTL) Unbiased + Slew Rate (V/uS) 15.000 13.000 Average Unbiased 11.000 Ps90%/90% (-KTL) Unbiased 9.000 Specification MIN 7.000 5.000 0 5E+11 1E+12 Total Fluence (neutrons/cm2) 1.5E+12 Figure 5.5: Plot of Positive Slew Rate versus Total Fluence P a g e 14 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.5: Raw data table for Positive Slew Rate of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Positive Slew Rate Parameter Total Fluence (N/cm 2) Units (V/uS) 0 1E+12 28 Unbiased Irradiation 13.98887 13.25790 29 Unbiased Irradiation 14.80586 14.18451 32 Unbiased Irradiation 14.18449 13.61351 33 Unbiased Irradiation 15.25150 14.38572 34 Unbiased Irradiation 14.18449 13.61351 35 Control Unit 15.25150 14.80588 36 Control Unit 15.48460 15.02538 Unbiased Irradiation Statistics Average Unbiased 14.48304 13.81103 Std Dev Unbiased 0.52849 0.46199 Ps90%/90% (+KTL) Unbiased 15.93216 15.07781 Ps90%/90% (-KTL) Unbiased 13.03392 12.54425 Specification MIN 11.0 7.5 Status (Measurements) Unbiased PASS PASS Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 15 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 17.000 Ps90%/90% (+KTL) Unbiased - Slew Rate (V/uS) 15.000 13.000 Average Unbiased 11.000 Ps90%/90% (-KTL) Unbiased 9.000 Specification MIN 7.000 5.000 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.6: Plot of Negative Slew Rate versus Total Fluence P a g e 16 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.6: Raw data table for Negative Slew Rate of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Negative Slew Rate Parameter Total Fluence (N/cm 2) Units (V/uS) 0 1E+12 28 Unbiased Irradiation 14.08887 13.53333 29 Unbiased Irradiation 14.90586 14.28451 32 Unbiased Irradiation 14.28449 13.89863 33 Unbiased Irradiation 15.12535 14.48572 34 Unbiased Irradiation 14.28449 13.89863 35 Control Unit 14.90586 15.12537 36 Control Unit 15.35149 15.12537 Unbiased Irradiation Statistics Average Unbiased 14.53781 14.02016 Std Dev Unbiased 0.45015 0.37188 Ps90%/90% (+KTL) Unbiased 15.77213 15.03985 Ps90%/90% (-KTL) Unbiased 13.30349 13.00048 Specification MIN 11.0 7.5 Status (Measurements) Unbiased PASS PASS Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 17 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 CMMR (dB) @ +/- 15V 130.000 125.000 Ps90%/90% (+KTL) Unbiased 120.000 Average Unbiased 115.000 Ps90%/90% (-KTL) Unbiased 110.000 Specification MIN 105.000 0 5E+11 1E+12 1.5E+12 Total Fluence (neutrons/cm2) Figure 5.7: Plot of Common Mode Rejection Rate versus Total Fluence P a g e 18 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.7: Raw data table for Common Mode Rejection Rate of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). CMRR @+/-15V; CMR @+/-11.V Total Fluence (N/cm 2) Parameter Units (dB) 0 1E+12 28 Unbiased Irradiation 123.9118 123.3559 29 Unbiased Irradiation 122.6815 121.7427 32 Unbiased Irradiation 124.1027 122.8397 33 Unbiased Irradiation 123.7250 122.5119 34 Unbiased Irradiation 122.3597 121.3119 35 Control Unit 123.5422 123.3559 36 Control Unit 123.0156 123.3559 Unbiased Irradiation Statistics Average Unbiased 123.3561 122.3524 Std Dev Unbiased 0.7827 0.8253 Ps90%/90% (+KTL) Unbiased 125.5022 124.6153 Ps90%/90% (-KTL) Unbiased 121.2101 120.0895 Specification MIN 110 106 Status (Measurements) Unbiased PASS PASS Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 19 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 150.000 PSSR (dB) @ +/- 4V to +/- 18V Ps90%/90% (+KTL) Unbiased 140.000 130.000 Average Unbiased 120.000 Ps90%/90% (-KTL) Unbiased 110.000 Specification MIN 100.000 90.000 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.8: Plot of Power Supply Rejection Rate versus Total Fluence P a g e 20 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.8: Raw data table for Power Supply Rejection Rate of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). PSRR,+/-4 TO +/-18 Parameter Total Fluence (N/cm 2) Units (dB) 0 1E+12 28 Unbiased Irradiation 131.5675 140.9254 29 Unbiased Irradiation 129.2955 136.1023 32 Unbiased Irradiation 129.5757 135.6606 33 Unbiased Irradiation 130.3574 137.0595 34 Unbiased Irradiation 129.1587 136.4098 35 Control Unit 130.1268 130.7080 36 Control Unit 130.4750 130.2341 Unbiased Irradiation Statistics Average Unbiased 129.9910 137.2315 Std Dev Unbiased 0.9961 2.1268 Ps90%/90% (+KTL) Unbiased 132.7221 143.0631 Ps90%/90% (-KTL) Unbiased 127.2598 131.3999 Specification MIN 110 104 Status (Measurements) Unbiased PASS PASS Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 21 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 AVol (VuV) @ +/- 15V, Rl = 2KΩ 1000.00 800.00 Ps90%/90% (+KTL) Unbiased 600.00 400.00 Average Unbiased 200.00 0.00 Specification MIN -200.00 -400.00 Ps90%/90% (-KTL) Unbiased -600.00 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.9: Plot of Large Signal Voltage Gain versus Total Fluence P a g e 22 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.9: Raw data table for Large Signal Voltage Gain of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Parameter Units 28 29 32 33 34 35 36 AVOL @+/-15V; VO=-10V TO 10V; RL=2K (V/uV) Unbiased Irradiation Unbiased Irradiation Unbiased Irradiation Unbiased Irradiation Unbiased Irradiation Control Unit Control Unit Unbiased Irradiation Statistics Average Unbiased Std Dev Unbiased Ps90%/90% (+KTL) Unbiased Ps90%/90% (-KTL) Unbiased Specification MIN Status (Measurements) Unbiased Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased Total Fluence (N/cm 2) 0 1E+12 22.53 11.50 32.77 540.27 22.53 15.89 19.31 52.71 37.95 93.96 22.30 33.25 23.51 13.26 27.02 7.94 48.79 5.25 5 PASS 142.87 224.63 758.80 -473.07 2 PASS PASS FAIL P a g e 23 | 36 LINEAR TECHNOLOGY CORPORATION + Ouput Swing @ +/- 15V, RL =2KΩ DDD RH1028MW W1117814.1 W2 13.750 Ps90%/90% (+KTL) Unbiased 13.250 Average Unbiased 12.750 12.250 Ps90%/90% (-KTL) Unbiased 11.750 Specification MIN 11.250 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.10: Plot of Positive Output Swing @ RL = 2KΩ versus Total Fluence P a g e 24 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.10: Raw data table for Positive Output Swing at RL = 2KΩ of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Parameter Pos. Output Swing @+/-15V;R=2K Total Fluence (N/cm 2) Units (V) 0 1E+12 28 Unbiased Irradiation 13.54872 13.55609 29 Unbiased Irradiation 13.54727 13.55647 32 Unbiased Irradiation 13.54597 13.55465 33 Unbiased Irradiation 13.54903 13.56182 34 Unbiased Irradiation 13.54475 13.55465 35 Control Unit 13.54300 13.54427 36 Control Unit 13.54300 13.54297 Unbiased Irradiation Statistics Average Unbiased 13.54715 13.55674 Std Dev Unbiased 0.00181 0.00296 Ps90%/90% (+KTL) Unbiased 13.55212 13.56485 Ps90%/90% (-KTL) Unbiased 13.54217 13.54862 Specification MIN 12.0 11.5 Status (Measurements) Unbiased PASS PASS Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 25 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 - Output Swing (V) @ +/- 15V, Rl = 2KΩ -11.0 -11.5 Specification MAX -12.0 Ps90%/90% (+KTL) Unbiased -12.5 -13.0 Average Unbiased -13.5 Ps90%/90% (-KTL) Unbiased -14.0 -14.5 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.11: Plot of Negative Output Swing @ RL = 2KΩ versus Total Fluence P a g e 26 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.11: Raw data table for Negative Output Swing at RL = 2KΩ of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Parameter - OUTPUT SWING @+/-15V; RL=2K Total Fluence (N/cm 2) Units (V) 0 1E+12 28 Unbiased Irradiation -13.87552 -13.82982 29 Unbiased Irradiation -13.88651 -13.84446 32 Unbiased Irradiation -13.87583 -13.82982 33 Unbiased Irradiation -13.89230 -13.85057 34 Unbiased Irradiation -13.87568 -13.82928 35 Control Unit -13.88438 -13.88873 36 Control Unit -13.88856 -13.89278 Unbiased Irradiation Statistics Average Unbiased -13.88117 -13.83679 Std Dev Unbiased 0.00779 0.01003 Ps90%/90% (+KTL) Unbiased -13.85980 -13.80929 Ps90%/90% (-KTL) Unbiased -13.90254 -13.86429 Specification MIN Status (Measurements) Unbiased Specification MAX -12.0 -11.5 Status (Measurements) Unbiased PASS PASS Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 27 | 36 LINEAR TECHNOLOGY CORPORATION + Output Voltage (V) @ +/- 15V, Rl = 600Ω DDD RH1028MW W1117814.1 W2 12.50000 Ps90%/90% (+KTL) Unbiased 12.00000 11.50000 Average Unbiased 11.00000 Ps90%/90% (-KTL) Unbiased 10.50000 Specification MIN 10.00000 9.50000 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.12: Plot of Positive Output Swing Voltage VOUT with RL = 600Ω versus Total Fluence P a g e 28 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.12: Raw data table for Positive Output Swing at RL = 600Ω of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Parameter + OUTPUT VOLTAGE @+/-15V; RL=600 Total Fluence (N/cm 2) Units V 0 1E+12 28 Unbiased Irradiation 11.90738 11.88852 29 Unbiased Irradiation 11.99483 11.97292 32 Unbiased Irradiation 11.89494 11.85434 33 Unbiased Irradiation 12.00208 11.97032 34 Unbiased Irradiation 11.91470 11.87730 35 Control Unit 11.95882 11.94544 36 Control Unit 12.01300 12.00756 Unbiased Irradiation Statistics Average Unbiased 11.94279 11.91268 Std Dev Unbiased 0.05137 0.05520 Ps90%/90% (+KTL) Unbiased 12.08365 12.06405 Ps90%/90% (-KTL) Unbiased 11.80193 11.76131 Specification MIN 10.5 10.0 Status (Measurements) Unbiased PASS PASS Specification MAX Status (Measurements) Unbiased Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 29 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 - Output Swing (V) +/- 15V, RL = 600Ω -9.000 -9.500 Specification MAX -10.000 -10.500 Ps90%/90% (+KTL) Unbiased -11.000 Average Unbiased -11.500 -12.000 Ps90%/90% (-KTL) Unbiased -12.500 -13.000 0 5E+11 Total Fluence 1E+12 1.5E+12 (neutrons/cm2) Figure 5.13: Plot of Negative Output Swing Voltage VOUT with RL = 600Ω versus Total Fluence P a g e 30 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Table 5.13: Raw data table for Negative Output Swing at RL = 600Ω of pre- and post-irradiation (1E12 N/cm2) including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL). Parameter - OUTPUT SWING @+/-15V; RL=600 Total Fluence (N/cm 2) Units (V) 0 1E+12 28 Unbiased Irradiation -12.20846 -11.99352 29 Unbiased Irradiation -12.31561 -12.02069 32 Unbiased Irradiation -12.21532 -11.98162 33 Unbiased Irradiation -12.33612 -12.03648 34 Unbiased Irradiation -12.24821 -11.98520 35 Control Unit -12.29942 -12.29112 36 Control Unit -12.34957 -12.34728 Unbiased Irradiation Statistics Average Unbiased -12.26474 -12.00350 Std Dev Unbiased 0.05824 0.02396 Ps90%/90% (+KTL) Unbiased -12.10506 -11.93780 Ps90%/90% (-KTL) Unbiased -12.42443 -12.06920 Specification MIN Status (Measurements) Unbiased Specification MAX -10.5 -10.0 Status (Measurements) Unbiased PASS PASS Status (-KTL) Unbiased Status (+KTL) Unbiased PASS PASS P a g e 31 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Appendix A Pictures of one among five samples used in the test. Figure A1: Top View showing date code Figure A2: Bottom View showing serial number P a g e 32 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Appendix B Radiation Bias Connection Table Table B1: Unbias condition Pin Function Connection 1 2 3 NC VOS TRIM -IN +IN VOvercomp VOUT V+ VOS TRIM NC Float Float Float Float Float Float Float Float Float Float 4 5 6 7 8 9 10 P a g e 33 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Figure B1: Pin-Out P a g e 34 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Appendix C P a g e 35 | 36 LINEAR TECHNOLOGY CORPORATION DDD RH1028MW W1117814.1 W2 Appendix D Table D1: Electrical Characteristics of Device-Under-Test Parameter Pre-irradiation MIN MAX 10 Krad(Si) MIN MAX 20 Krad(Si) MIN MAX 50 Krad(Si) MIN MAX 100 Krad(Si) MIN MAX 200 Krad(Si) MIN MAX Units Input Offset Voltage 80 100 120 140 160 180 uV Input Offset Current 150 200 200 200 300 500 nA + Input Bias Current +/-400 +/-600 +/-700 +/-950 +/-1100 +/-1700 nA - Input Bias Current +/-400 +/-600 +/-700 +/-950 +/-1100 +/-1700 nA + Slew Rate 11 7.5 7.5 7.5 7.5 7.5 V/uS - Slew Rate 11 7.5 7.5 7.5 7.5 7.5 V/uS CMRR 110 106 106 106 106 106 dB PSRR 110 104 104 104 104 104 dB AVOL (RL = 2 KΩ) 5 2 2 2 2 2 VOUT (+) (RL = 2 KΩ) 12 11.5 11.5 11.5 11.5 11.5 VOUT (-) (RL = 2 KΩ) VOUT (+) (RL = 600 Ω) VOUT (-) (RL = 600 Ω) -12 10.5 -11.5 10 -10.5 -11.5 10 -10 -11.5 10 -10 -11.5 10 -10 V/uV V -11.5 10 -10 V V -10 V P a g e 36 | 36 LINEAR TECHNOLOGY CORPORATION