RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH6200MW Low Noise Rail-to-Rail Input and Output Op Amp for Linear Technology Customer: Linear Technology, PO# 7128F RAD Job Number: 10-447 Part Type Tested: RH6200MW Low Noise Rail-to-Rail Input and Output Op Amp. Traceability Information/Lot Number/ Date Code: Lot Number: WD004518.3, Wafer Number: 8. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 units for control. Serial numbers 1, 2, 3, 4 and 5 were biased during irradiation, serial numbers 6, 7, 8, 9, and 10 were unbiased during irradiation and serial numbers 11 and 12 were used as control. See Appendix B for the radiation bias connection table. Radiation and Electrical Test Increments: 50rad(Si)/s ionizing radiation with electrical test increments: preirradiation, 10krad(Si), 20krad(Si), 50krad(Si), 100krad(Si) and 200krad(Si). Pre-Irradiation Burn-In: Burn-In performed by linear Technology prior to receipt by RAD. Overtest and Post-Irradiation Anneal: No overtest. No anneal. Radiation Test Standard: MIL-STD 883 and/or MIL-STD-750 TM1019 (latest revision), Condition A. Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS03, Calibration Date: 04-28-10, Calibration Due 04-28-11. LTS2100 Family Board, Entity ID FB01. LTS0600 Test Fixture, Entity ID TF03. Test Program: RH6200.SRC Facility and Radiation Source: Radiation Assured Devices' Longmire Laboratories, Colorado Springs, CO. Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD's dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD750 and MIL-STD-883 TM 1019. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MILSTD-750. RLAT Result: PASSED. The units showed no significant degradation with total dose. All parameters remained within their datasheet specifications to the maximum dose level tested of 200krad(Si) An ISO 9001:2008 and DSCC Certified Company 1 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.8 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.8 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices' Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using air ionization chamber (AIC) equipment calibrated with traceability to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 8124 Co-60 irradiator at RAD's Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750 and MIL-STD-883. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD's report to DSCC entitled: "Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices". An ISO 9001:2008 and DSCC Certified Company 2 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices' high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2008 and DSCC Certified Company 3 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH6200 Low Noise Rail-to-Rail Input and Output Op Amp described in this final report was irradiated using a split 5V supply and with all pins tied to ground, that is biased and unbiased. See the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit satisfies the requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states "The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias." The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 10krad(Si), 20krad(Si), 50krad(Si) and 100krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted." The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total dose irradiations. The final dose rate for this work was 53.02rad(Si)/s with a precision of ±5%. An ISO 9001:2008 and DSCC Certified Company 4 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the radiation lot acceptance testing the following electrical parameters were measured pre- and post-irradiation: 1. 2. 3. 4. 5. 6. 7. 8. 9. 10. 11. 12. 13. 14. 15. Positive Supply Current Negative Supply Current Disabled Supply Current SHDN Pin Current CMRR PSRR Large Signal Voltage Gain Output Voltage Swing High Output Voltage Swing Low Positive Short-Circuit Current Negative Short-Circuit Current Input Offset Voltage Input Offset Current + Input Bias Current – Input Bias Current Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as "read and record" and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the total ionizing dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. An ISO 9001:2008 and DSCC Certified Company 5 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 5.0. Total Ionizing Dose Test Results Based on this criterion the RH6200 Low Noise Rail-to-Rail Input and Output Op Amp (from the lot date code identified on the first page of this test report) PASSED the total ionizing dose test to the maximum tested dose level of 200krad(Si) with no significant degradation and with all parameters remaining within their datasheet specifications. Note that after the maximum total ionizing dose level of 200krad(Si), IB- @ ±2.5V VCM=V- on unit 6 was in error. Once the error was discovered, all unitsunder-test were re-tested 10-days after the 200krad(Si) ionizing dose level and the measured electrical data for all the units except unit 6 showed no significant change in 10-days. Therefore, it is assumed that unit 6 characteristics did not change significantly in 10-days and all the erroneous electrical test data measured for unit 6 were replaced with the data collected 10-days later. Figures 5.1 through 5.49 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 - 5.49 show the corresponding raw data for each of these parameters. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained in control throughout the duration of the tests and the observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section to facilitate the location of a particular parameter. An ISO 9001:2008 and DSCC Certified Company 6 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased + SUPPLY CURRENT @ +/-2.5V 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.1. Plot of + SUPPLY CURRENT @ +/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 7 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.1. Raw data for + SUPPLY CURRENT @ +/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). + SUPPLY CURRENT @ +/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.68E-02 1.67E-02 1.68E-02 1.68E-02 1.67E-02 1.67E-02 1.66E-02 1.66E-02 1.65E-02 1.70E-02 1.70E-02 1.69E-02 1.67E-02 1.67E-02 1.66E-02 1.70E-02 1.69E-02 1.71E-02 1.65E-02 1.65E-02 1.64E-02 1.73E-02 1.73E-02 1.72E-02 1.72E-02 1.72E-02 1.71E-02 1.72E-02 1.72E-02 1.71E-02 1.68E-02 1.68E-02 1.69E-02 1.69E-02 1.71E-02 1.70E-02 0 1.69E-02 1.71E-02 1.67E-02 1.72E-02 1.69E-02 1.71E-02 1.66E-02 1.73E-02 1.76E-02 1.75E-02 1.71E-02 1.75E-02 10 1.67E-02 1.67E-02 1.66E-02 1.70E-02 1.67E-02 1.70E-02 1.65E-02 1.73E-02 1.72E-02 1.72E-02 1.68E-02 1.69E-02 1.70E-02 1.82E-04 1.75E-02 1.65E-02 1.67E-02 1.73E-04 1.72E-02 1.63E-02 1.68E-02 1.65E-04 1.72E-02 1.63E-02 1.67E-02 1.63E-04 1.72E-02 1.63E-02 1.67E-02 1.61E-04 1.71E-02 1.63E-02 1.63E-02 1.53E-04 1.68E-02 1.59E-02 1.72E-02 4.01E-04 1.83E-02 1.61E-02 2.00E-02 PASS 1.70E-02 3.04E-04 1.79E-02 1.62E-02 2.00E-02 PASS 1.70E-02 3.33E-04 1.80E-02 1.61E-02 2.00E-02 PASS 1.70E-02 3.20E-04 1.79E-02 1.61E-02 2.00E-02 PASS 1.70E-02 3.34E-04 1.79E-02 1.61E-02 2.00E-02 PASS 1.68E-02 3.40E-04 1.77E-02 1.59E-02 2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 8 200 1.62E-02 1.65E-02 1.62E-02 1.65E-02 1.63E-02 1.69E-02 1.62E-02 1.71E-02 1.69E-02 1.70E-02 1.68E-02 1.70E-02 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased - SUPPLY CURRENT @ +/-2.5V 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.2. Plot of - SUPPLY CURRENT @ +/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 9 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.2. Raw data for - SUPPLY CURRENT @ +/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). - SUPPLY CURRENT @ +/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.69E-02 -1.71E-02 -1.68E-02 -1.72E-02 -1.69E-02 -1.71E-02 -1.66E-02 -1.73E-02 -1.76E-02 -1.75E-02 -1.71E-02 -1.75E-02 10 -1.67E-02 -1.67E-02 -1.66E-02 -1.70E-02 -1.67E-02 -1.70E-02 -1.65E-02 -1.73E-02 -1.72E-02 -1.72E-02 -1.68E-02 -1.70E-02 Total Dose (krad(Si)) 20 50 -1.68E-02 -1.67E-02 -1.68E-02 -1.67E-02 -1.66E-02 -1.66E-02 -1.70E-02 -1.70E-02 -1.67E-02 -1.67E-02 -1.70E-02 -1.70E-02 -1.65E-02 -1.65E-02 -1.73E-02 -1.73E-02 -1.72E-02 -1.72E-02 -1.72E-02 -1.72E-02 -1.68E-02 -1.68E-02 -1.69E-02 -1.71E-02 100 -1.68E-02 -1.67E-02 -1.65E-02 -1.69E-02 -1.66E-02 -1.71E-02 -1.64E-02 -1.72E-02 -1.71E-02 -1.71E-02 -1.69E-02 -1.70E-02 200 -1.62E-02 -1.65E-02 -1.62E-02 -1.65E-02 -1.63E-02 -1.69E-02 -1.62E-02 -1.71E-02 -1.70E-02 -1.70E-02 -1.68E-02 -1.70E-02 -1.70E-02 1.81E-04 -1.65E-02 -1.75E-02 -1.67E-02 1.75E-04 -1.63E-02 -1.72E-02 -1.68E-02 1.66E-04 -1.63E-02 -1.72E-02 -1.67E-02 1.60E-04 -1.63E-02 -1.72E-02 -1.67E-02 1.60E-04 -1.63E-02 -1.71E-02 -1.63E-02 1.56E-04 -1.59E-02 -1.68E-02 -1.72E-02 4.01E-04 -1.61E-02 -1.83E-02 -2.00E-02 PASS -1.70E-02 3.03E-04 -1.62E-02 -1.79E-02 -2.00E-02 PASS -1.70E-02 3.34E-04 -1.61E-02 -1.80E-02 -2.00E-02 PASS -1.70E-02 3.25E-04 -1.61E-02 -1.79E-02 -2.00E-02 PASS -1.70E-02 3.37E-04 -1.60E-02 -1.79E-02 -2.00E-02 PASS -1.68E-02 3.38E-04 -1.59E-02 -1.78E-02 -2.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 10 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased + S/D SUPPLY CURRENT @ +/-2.5V 2.00E-03 1.80E-03 1.60E-03 1.40E-03 1.20E-03 1.00E-03 8.00E-04 6.00E-04 4.00E-04 2.00E-04 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.3. Plot of + S/D SUPPLY CURRENT @ +/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 11 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.3. Raw data for + S/D SUPPLY CURRENT @ +/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). + S/D SUPPLY CURRENT @ +/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.20E-03 1.19E-03 1.18E-03 1.20E-03 1.19E-03 1.18E-03 1.20E-03 1.20E-03 1.19E-03 1.22E-03 1.21E-03 1.20E-03 1.20E-03 1.19E-03 1.18E-03 1.22E-03 1.21E-03 1.21E-03 1.22E-03 1.22E-03 1.21E-03 1.23E-03 1.22E-03 1.22E-03 1.23E-03 1.22E-03 1.22E-03 1.22E-03 1.22E-03 1.21E-03 1.28E-03 1.28E-03 1.28E-03 1.22E-03 1.22E-03 1.22E-03 0 1.23E-03 1.23E-03 1.23E-03 1.25E-03 1.22E-03 1.22E-03 1.23E-03 1.24E-03 1.24E-03 1.23E-03 1.29E-03 1.23E-03 10 1.21E-03 1.20E-03 1.21E-03 1.22E-03 1.20E-03 1.22E-03 1.22E-03 1.23E-03 1.23E-03 1.22E-03 1.28E-03 1.22E-03 1.23E-03 9.29E-06 1.26E-03 1.21E-03 1.21E-03 8.87E-06 1.23E-03 1.18E-03 1.20E-03 8.14E-06 1.23E-03 1.18E-03 1.20E-03 7.58E-06 1.22E-03 1.18E-03 1.19E-03 7.92E-06 1.21E-03 1.16E-03 1.16E-03 5.96E-06 1.18E-03 1.15E-03 1.23E-03 7.95E-06 1.25E-03 1.21E-03 1.80E-03 PASS 1.22E-03 4.67E-06 1.24E-03 1.21E-03 1.80E-03 PASS 1.22E-03 5.83E-06 1.24E-03 1.21E-03 1.80E-03 PASS 1.22E-03 5.13E-06 1.23E-03 1.20E-03 1.80E-03 PASS 1.21E-03 5.40E-06 1.23E-03 1.20E-03 1.80E-03 PASS 1.20E-03 6.22E-06 1.22E-03 1.18E-03 1.80E-03 PASS An ISO 9001:2008 and DSCC Certified Company 12 200 1.16E-03 1.16E-03 1.16E-03 1.17E-03 1.16E-03 1.20E-03 1.19E-03 1.21E-03 1.21E-03 1.20E-03 1.28E-03 1.22E-03 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased S/D PIN CURRENT @ +/-2.5V 0.00E+00 -5.00E-05 -1.00E-04 -1.50E-04 -2.00E-04 -2.50E-04 -3.00E-04 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.4. Plot of S/D PIN CURRENT @ +/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 13 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.4. Raw data for S/D PIN CURRENT @ +/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). S/D PIN CURRENT @ +/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.95E-04 -1.95E-04 -1.95E-04 -1.96E-04 -1.94E-04 -1.95E-04 -1.96E-04 -1.95E-04 -1.96E-04 -1.95E-04 -1.95E-04 -1.95E-04 10 -1.95E-04 -1.94E-04 -1.94E-04 -1.96E-04 -1.93E-04 -1.94E-04 -1.95E-04 -1.95E-04 -1.95E-04 -1.94E-04 -1.94E-04 -1.94E-04 Total Dose (krad(Si)) 20 50 -1.95E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.96E-04 -1.95E-04 -1.93E-04 -1.93E-04 -1.94E-04 -1.94E-04 -1.95E-04 -1.94E-04 -1.95E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.94E-04 100 -1.94E-04 -1.93E-04 -1.93E-04 -1.94E-04 -1.92E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.93E-04 -1.93E-04 -1.94E-04 -1.94E-04 200 -1.92E-04 -1.92E-04 -1.92E-04 -1.93E-04 -1.91E-04 -1.93E-04 -1.92E-04 -1.92E-04 -1.92E-04 -1.91E-04 -1.94E-04 -1.93E-04 -1.95E-04 8.80E-07 -1.93E-04 -1.98E-04 -1.94E-04 8.37E-07 -1.92E-04 -1.97E-04 -1.94E-04 8.45E-07 -1.92E-04 -1.97E-04 -1.94E-04 8.27E-07 -1.92E-04 -1.96E-04 -1.93E-04 8.21E-07 -1.91E-04 -1.96E-04 -1.92E-04 6.83E-07 -1.90E-04 -1.94E-04 -1.95E-04 4.98E-07 -1.94E-04 -1.97E-04 -2.80E-04 PASS -1.94E-04 5.38E-07 -1.93E-04 -1.96E-04 -2.80E-04 PASS -1.94E-04 4.64E-07 -1.93E-04 -1.96E-04 -2.80E-04 PASS -1.94E-04 4.67E-07 -1.93E-04 -1.95E-04 -2.80E-04 PASS -1.93E-04 4.54E-07 -1.92E-04 -1.95E-04 -2.80E-04 PASS -1.92E-04 5.70E-07 -1.91E-04 -1.94E-04 -2.80E-04 PASS An ISO 9001:2008 and DSCC Certified Company 14 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased CMRR @ +/-2.5V VCM=+/-1V 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.5. Plot of CMRR @ +/-2.5V VCM=+/-1V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 15 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.5. Raw data for CMRR @ +/-2.5V VCM=+/-1V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR @ +/-2.5V VCM=+/-1V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.01E+02 9.90E+01 9.79E+01 1.09E+02 1.01E+02 1.17E+02 1.03E+02 1.08E+02 1.12E+02 1.07E+02 1.03E+02 1.05E+02 10 1.01E+02 9.94E+01 9.79E+01 1.10E+02 1.01E+02 1.18E+02 1.03E+02 1.08E+02 1.13E+02 1.07E+02 1.04E+02 1.06E+02 Total Dose (krad(Si)) 20 50 1.01E+02 1.01E+02 9.92E+01 9.93E+01 9.80E+01 9.80E+01 1.09E+02 1.10E+02 1.01E+02 1.01E+02 1.17E+02 1.18E+02 1.03E+02 1.03E+02 1.08E+02 1.08E+02 1.13E+02 1.13E+02 1.07E+02 1.07E+02 1.04E+02 1.04E+02 1.06E+02 1.06E+02 100 1.01E+02 9.93E+01 9.81E+01 1.09E+02 1.01E+02 1.18E+02 1.03E+02 1.08E+02 1.14E+02 1.07E+02 1.04E+02 1.06E+02 200 1.02E+02 9.97E+01 9.82E+01 1.09E+02 1.01E+02 1.19E+02 1.03E+02 1.08E+02 1.12E+02 1.07E+02 1.04E+02 1.06E+02 1.02E+02 4.49E+00 1.14E+02 8.95E+01 1.02E+02 4.52E+00 1.14E+02 8.96E+01 1.02E+02 4.45E+00 1.14E+02 8.96E+01 1.02E+02 4.49E+00 1.14E+02 8.96E+01 1.02E+02 4.40E+00 1.14E+02 8.97E+01 1.02E+02 4.29E+00 1.14E+02 9.01E+01 1.09E+02 5.41E+00 1.24E+02 9.46E+01 8.50E+01 PASS 1.10E+02 5.75E+00 1.25E+02 9.38E+01 8.50E+01 PASS 1.10E+02 5.58E+00 1.25E+02 9.43E+01 8.50E+01 PASS 1.10E+02 5.83E+00 1.26E+02 9.38E+01 8.50E+01 PASS 1.10E+02 5.91E+00 1.26E+02 9.36E+01 8.50E+01 PASS 1.10E+02 6.00E+00 1.26E+02 9.33E+01 8.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 16 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 9.00E+01 CMRR @ +/-2.5V VCM=+/-2.5V 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.6. Plot of CMRR @ +/-2.5V VCM=+/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 17 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.6. Raw data for CMRR @ +/-2.5V VCM=+/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR @ +/-2.5V VCM=+/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 7.52E+01 7.44E+01 7.37E+01 8.32E+01 7.48E+01 8.60E+01 7.70E+01 7.70E+01 9.03E+01 8.37E+01 7.72E+01 7.70E+01 10 7.53E+01 7.45E+01 7.38E+01 8.33E+01 7.49E+01 8.61E+01 7.71E+01 7.70E+01 8.97E+01 8.39E+01 7.74E+01 7.73E+01 Total Dose (krad(Si)) 20 50 7.52E+01 7.51E+01 7.44E+01 7.44E+01 7.37E+01 7.37E+01 8.32E+01 8.31E+01 7.48E+01 7.48E+01 8.60E+01 8.59E+01 7.71E+01 7.70E+01 7.69E+01 7.69E+01 8.98E+01 9.03E+01 8.38E+01 8.37E+01 7.74E+01 7.74E+01 7.73E+01 7.72E+01 100 7.50E+01 7.43E+01 7.37E+01 8.30E+01 7.48E+01 8.56E+01 7.69E+01 7.68E+01 9.06E+01 8.36E+01 7.74E+01 7.73E+01 200 7.50E+01 7.43E+01 7.37E+01 8.29E+01 7.48E+01 8.57E+01 7.68E+01 7.67E+01 9.12E+01 8.35E+01 7.74E+01 7.73E+01 7.63E+01 3.92E+00 8.70E+01 6.55E+01 7.63E+01 3.91E+00 8.71E+01 6.56E+01 7.63E+01 3.91E+00 8.70E+01 6.56E+01 7.62E+01 3.88E+00 8.69E+01 6.56E+01 7.62E+01 3.85E+00 8.67E+01 6.56E+01 7.62E+01 3.83E+00 8.66E+01 6.57E+01 8.28E+01 5.79E+00 9.86E+01 6.69E+01 6.50E+01 PASS 8.27E+01 5.62E+00 9.82E+01 6.73E+01 6.50E+01 PASS 8.27E+01 5.65E+00 9.82E+01 6.72E+01 6.50E+01 PASS 8.27E+01 5.81E+00 9.87E+01 6.68E+01 6.50E+01 PASS 8.27E+01 5.93E+00 9.90E+01 6.64E+01 6.50E+01 PASS 8.28E+01 6.16E+00 9.97E+01 6.59E+01 6.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 18 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL @ +/-2.5V RL=1K VO=+/-2V 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.7. Plot of AVOL @ +/-2.5V RL=1K VO=+/-2V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 19 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.7. Raw data for AVOL @ +/-2.5V RL=1K VO=+/-2V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL @ +/-2.5V RL=1K VO=+/-2V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.18E+02 1.18E+02 1.18E+02 1.13E+02 1.21E+02 1.10E+02 1.18E+02 1.13E+02 1.14E+02 1.13E+02 1.19E+02 1.10E+02 10 1.18E+02 1.19E+02 1.17E+02 1.12E+02 1.20E+02 1.10E+02 1.19E+02 1.12E+02 1.16E+02 1.14E+02 1.20E+02 1.12E+02 Total Dose (krad(Si)) 20 50 1.17E+02 1.17E+02 1.19E+02 1.17E+02 1.16E+02 1.17E+02 1.11E+02 1.11E+02 1.19E+02 1.19E+02 1.09E+02 1.08E+02 1.18E+02 1.18E+02 1.12E+02 1.12E+02 1.14E+02 1.14E+02 1.13E+02 1.12E+02 1.21E+02 1.21E+02 1.12E+02 1.11E+02 100 1.14E+02 1.16E+02 1.14E+02 1.08E+02 1.17E+02 1.06E+02 1.16E+02 1.11E+02 1.11E+02 1.12E+02 1.20E+02 1.13E+02 200 1.11E+02 1.13E+02 1.11E+02 1.06E+02 1.13E+02 1.06E+02 1.14E+02 1.06E+02 1.08E+02 1.08E+02 1.20E+02 1.12E+02 1.18E+02 2.76E+00 1.25E+02 1.10E+02 1.17E+02 3.05E+00 1.26E+02 1.09E+02 1.16E+02 3.18E+00 1.25E+02 1.08E+02 1.16E+02 2.93E+00 1.24E+02 1.08E+02 1.14E+02 3.35E+00 1.23E+02 1.05E+02 1.11E+02 2.95E+00 1.19E+02 1.03E+02 1.14E+02 3.10E+00 1.22E+02 1.05E+02 7.00E+01 PASS 1.14E+02 3.41E+00 1.23E+02 1.05E+02 7.00E+01 PASS 1.13E+02 3.19E+00 1.22E+02 1.05E+02 7.00E+01 PASS 1.13E+02 3.65E+00 1.23E+02 1.03E+02 7.00E+01 PASS 1.11E+02 3.51E+00 1.21E+02 1.01E+02 7.00E+01 PASS 1.08E+02 3.17E+00 1.17E+02 9.96E+01 7.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 20 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL @ +/-2.5V RL=100 VO=+/-1.5V 2.00E+01 1.80E+01 1.60E+01 1.40E+01 1.20E+01 1.00E+01 8.00E+00 6.00E+00 4.00E+00 2.00E+00 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.8. Plot of AVOL @ +/-2.5V RL=100 VO=+/-1.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 21 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.8. Raw data for AVOL @ +/-2.5V RL=100 VO=+/-1.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL @ +/-2.5V RL=100 VO=+/-1.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.80E+01 1.80E+01 1.80E+01 1.72E+01 1.82E+01 1.65E+01 1.80E+01 1.72E+01 1.73E+01 1.71E+01 1.81E+01 1.68E+01 10 1.79E+01 1.80E+01 1.78E+01 1.71E+01 1.81E+01 1.65E+01 1.80E+01 1.72E+01 1.74E+01 1.73E+01 1.83E+01 1.70E+01 Total Dose (krad(Si)) 20 50 1.78E+01 1.76E+01 1.79E+01 1.78E+01 1.78E+01 1.77E+01 1.71E+01 1.69E+01 1.81E+01 1.80E+01 1.65E+01 1.63E+01 1.80E+01 1.78E+01 1.71E+01 1.70E+01 1.74E+01 1.72E+01 1.72E+01 1.71E+01 1.83E+01 1.83E+01 1.70E+01 1.70E+01 100 1.72E+01 1.75E+01 1.74E+01 1.66E+01 1.77E+01 1.60E+01 1.76E+01 1.68E+01 1.70E+01 1.69E+01 1.82E+01 1.70E+01 200 1.68E+01 1.71E+01 1.69E+01 1.61E+01 1.72E+01 1.59E+01 1.71E+01 1.63E+01 1.65E+01 1.66E+01 1.83E+01 1.70E+01 1.79E+01 3.90E-01 1.89E+01 1.68E+01 1.78E+01 3.96E-01 1.89E+01 1.67E+01 1.77E+01 3.78E-01 1.88E+01 1.67E+01 1.76E+01 4.18E-01 1.87E+01 1.65E+01 1.73E+01 4.21E-01 1.84E+01 1.61E+01 1.68E+01 4.32E-01 1.80E+01 1.56E+01 1.72E+01 5.36E-01 1.87E+01 1.58E+01 1.10E+01 PASS 1.73E+01 5.36E-01 1.87E+01 1.58E+01 1.10E+01 PASS 1.72E+01 5.41E-01 1.87E+01 1.58E+01 1.10E+01 PASS 1.71E+01 5.36E-01 1.85E+01 1.56E+01 1.10E+01 PASS 1.69E+01 5.73E-01 1.84E+01 1.53E+01 1.10E+01 PASS 1.65E+01 4.38E-01 1.77E+01 1.53E+01 1.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 22 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 VOH @ +/-2.5V IL=0 -2.00E-02 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.9. Plot of VOH @ +/-2.5V IL=0 versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 23 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.9. Raw data for VOH @ +/-2.5V IL=0 versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOH @ +/-2.5V IL=0 Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -4.54E-02 -4.67E-02 -4.68E-02 -4.49E-02 -4.65E-02 -4.51E-02 -4.51E-02 -4.48E-02 -4.73E-02 -4.71E-02 -4.72E-02 -4.75E-02 10 -4.48E-02 -4.52E-02 -4.64E-02 -4.45E-02 -4.60E-02 -4.45E-02 -4.45E-02 -4.48E-02 -4.58E-02 -4.60E-02 -4.59E-02 -4.56E-02 Total Dose (krad(Si)) 20 50 -4.53E-02 -4.54E-02 -4.57E-02 -4.54E-02 -4.66E-02 -4.64E-02 -4.46E-02 -4.44E-02 -4.61E-02 -4.61E-02 -4.48E-02 -4.44E-02 -4.46E-02 -4.46E-02 -4.48E-02 -4.46E-02 -4.59E-02 -4.59E-02 -4.60E-02 -4.58E-02 -4.58E-02 -4.63E-02 -4.53E-02 -4.60E-02 100 -4.58E-02 -4.59E-02 -4.64E-02 -4.47E-02 -4.58E-02 -4.51E-02 -4.44E-02 -4.44E-02 -4.55E-02 -4.56E-02 -4.61E-02 -4.56E-02 200 -4.42E-02 -4.52E-02 -4.59E-02 -4.37E-02 -4.54E-02 -4.47E-02 -4.37E-02 -4.41E-02 -4.47E-02 -4.52E-02 -4.60E-02 -4.55E-02 -4.61E-02 8.64E-04 -4.37E-02 -4.84E-02 -4.54E-02 8.07E-04 -4.32E-02 -4.76E-02 -4.57E-02 7.67E-04 -4.36E-02 -4.78E-02 -4.55E-02 7.60E-04 -4.34E-02 -4.76E-02 -4.57E-02 6.47E-04 -4.39E-02 -4.75E-02 -4.49E-02 9.16E-04 -4.24E-02 -4.74E-02 -4.59E-02 1.19E-03 -4.26E-02 -4.92E-02 -1.10E-01 PASS -4.51E-02 7.39E-04 -4.31E-02 -4.72E-02 -1.10E-01 PASS -4.52E-02 6.68E-04 -4.34E-02 -4.71E-02 -1.10E-01 PASS -4.51E-02 6.97E-04 -4.32E-02 -4.70E-02 -1.10E-01 PASS -4.50E-02 5.74E-04 -4.34E-02 -4.66E-02 -1.10E-01 PASS -4.45E-02 5.78E-04 -4.29E-02 -4.61E-02 -1.10E-01 PASS An ISO 9001:2008 and DSCC Certified Company 24 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 -2.00E-02 VOH @ +/-2.5V IL=5MA -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 -1.40E-01 -1.60E-01 -1.80E-01 -2.00E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.10. Plot of VOH @ +/-2.5V IL=5MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 25 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.10. Raw data for VOH @ +/-2.5V IL=5MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOH @ +/-2.5V IL=5MA Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -8.23E-02 -8.33E-02 -8.16E-02 -8.04E-02 -8.14E-02 -8.23E-02 -8.05E-02 -8.10E-02 -8.31E-02 -8.24E-02 -8.21E-02 -8.28E-02 10 -8.14E-02 -8.20E-02 -8.14E-02 -7.99E-02 -8.08E-02 -8.18E-02 -8.03E-02 -8.07E-02 -8.13E-02 -8.11E-02 -8.06E-02 -8.04E-02 Total Dose (krad(Si)) 20 50 -8.24E-02 -8.24E-02 -8.27E-02 -8.24E-02 -8.19E-02 -8.18E-02 -8.00E-02 -8.03E-02 -8.12E-02 -8.15E-02 -8.24E-02 -8.22E-02 -8.01E-02 -8.03E-02 -8.09E-02 -8.08E-02 -8.11E-02 -8.16E-02 -8.12E-02 -8.10E-02 -8.09E-02 -8.10E-02 -8.01E-02 -8.10E-02 100 -8.37E-02 -8.31E-02 -8.18E-02 -8.07E-02 -8.15E-02 -8.30E-02 -8.01E-02 -8.11E-02 -8.13E-02 -8.14E-02 -8.11E-02 -8.08E-02 200 -8.18E-02 -8.27E-02 -8.17E-02 -7.99E-02 -8.11E-02 -8.23E-02 -8.00E-02 -8.08E-02 -8.12E-02 -8.10E-02 -8.10E-02 -8.04E-02 -8.18E-02 1.07E-03 -7.89E-02 -8.47E-02 -8.11E-02 7.76E-04 -7.90E-02 -8.33E-02 -8.16E-02 1.05E-03 -7.87E-02 -8.45E-02 -8.17E-02 8.63E-04 -7.93E-02 -8.40E-02 -8.22E-02 1.22E-03 -7.88E-02 -8.55E-02 -8.14E-02 1.04E-03 -7.86E-02 -8.43E-02 -8.19E-02 1.08E-03 -7.89E-02 -8.48E-02 -1.90E-01 PASS -8.10E-02 5.90E-04 -7.94E-02 -8.27E-02 -1.90E-01 PASS -8.12E-02 8.25E-04 -7.89E-02 -8.34E-02 -1.90E-01 PASS -8.12E-02 7.53E-04 -7.91E-02 -8.33E-02 -1.90E-01 PASS -8.14E-02 1.07E-03 -7.85E-02 -8.43E-02 -1.90E-01 PASS -8.10E-02 8.26E-04 -7.88E-02 -8.33E-02 -1.90E-01 PASS An ISO 9001:2008 and DSCC Certified Company 26 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 3.00E-01 VOH @ +/-2.5V IL=20MA 2.00E-01 1.00E-01 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.11. Plot of VOH @ +/-2.5V IL=20MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 27 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.11. Raw data for VOH @ +/-2.5V IL=20MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOH @ +/-2.5V IL=20MA Device 1 2 3 4 5 6 7 8 9 10 11 12 0 2.00E-01 2.00E-01 1.91E-01 1.92E-01 1.92E-01 2.04E-01 1.93E-01 1.96E-01 1.95E-01 1.93E-01 1.93E-01 1.93E-01 10 2.00E-01 1.99E-01 1.92E-01 1.92E-01 1.92E-01 2.04E-01 1.93E-01 1.96E-01 1.93E-01 1.92E-01 1.90E-01 1.90E-01 Biased Statistics Average Biased 1.95E-01 1.95E-01 Std Dev Biased 4.51E-03 4.17E-03 Ps90%/90% (+KTL) Biased 2.07E-01 2.06E-01 Ps90%/90% (-KTL) Biased 1.83E-01 1.84E-01 Un-Biased Statistics Average Un-Biased 1.96E-01 1.95E-01 Std Dev Un-Biased 4.45E-03 4.89E-03 Ps90%/90% (+KTL) Un-Biased 2.08E-01 2.09E-01 Ps90%/90% (-KTL) Un-Biased 1.84E-01 1.82E-01 Specification MIN -4.00E-01 -4.00E-01 Status PASS PASS Total Dose (krad(Si)) 20 50 2.02E-01 2.02E-01 2.01E-01 2.01E-01 1.92E-01 1.93E-01 1.93E-01 1.94E-01 1.93E-01 1.94E-01 2.04E-01 2.05E-01 1.92E-01 1.93E-01 1.97E-01 1.97E-01 1.93E-01 1.94E-01 1.92E-01 1.93E-01 1.91E-01 1.91E-01 1.90E-01 1.91E-01 100 2.05E-01 2.03E-01 1.94E-01 1.95E-01 1.95E-01 2.06E-01 1.94E-01 1.98E-01 1.95E-01 1.93E-01 1.91E-01 1.91E-01 200 2.04E-01 2.03E-01 1.95E-01 1.95E-01 1.96E-01 2.06E-01 1.94E-01 1.98E-01 1.95E-01 1.94E-01 1.91E-01 1.91E-01 1.96E-01 4.68E-03 2.09E-01 1.83E-01 1.97E-01 4.47E-03 2.09E-01 1.85E-01 1.98E-01 5.12E-03 2.12E-01 1.84E-01 1.98E-01 4.72E-03 2.11E-01 1.86E-01 1.96E-01 5.15E-03 2.10E-01 1.82E-01 -4.00E-01 PASS 1.96E-01 4.96E-03 2.10E-01 1.83E-01 -4.00E-01 PASS 1.97E-01 5.45E-03 2.12E-01 1.82E-01 -4.00E-01 PASS 1.97E-01 5.18E-03 2.12E-01 1.83E-01 -4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 28 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 6.00E-02 VOL @ +/-2.5V IL=0 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.12. Plot of VOL @ +/-2.5V IL=0 versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 29 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.12. Raw data for VOL @ +/-2.5V IL=0 versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOL @ +/-2.5V IL=0 Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 8.51E-03 8.67E-03 9.29E-03 8.18E-03 8.53E-03 8.88E-03 8.47E-03 8.52E-03 8.53E-03 8.44E-03 8.63E-03 8.73E-03 8.32E-03 8.22E-03 8.63E-03 8.63E-03 9.12E-03 9.39E-03 8.54E-03 8.54E-03 8.88E-03 8.61E-03 9.09E-03 9.55E-03 8.52E-03 8.92E-03 8.99E-03 8.71E-03 8.80E-03 9.22E-03 8.07E-03 8.02E-03 8.05E-03 8.33E-03 8.24E-03 7.97E-03 0 8.37E-03 8.27E-03 8.12E-03 8.28E-03 8.13E-03 8.51E-03 8.16E-03 8.39E-03 8.54E-03 8.58E-03 8.53E-03 8.51E-03 10 8.32E-03 8.38E-03 8.20E-03 8.28E-03 8.11E-03 8.64E-03 8.24E-03 8.67E-03 8.46E-03 8.41E-03 8.41E-03 8.26E-03 8.23E-03 1.08E-04 8.53E-03 7.94E-03 8.26E-03 1.02E-04 8.54E-03 7.98E-03 8.38E-03 1.36E-04 8.75E-03 8.01E-03 8.51E-03 1.75E-04 8.99E-03 8.03E-03 8.81E-03 2.96E-04 9.62E-03 8.00E-03 9.03E-03 2.42E-04 9.70E-03 8.37E-03 8.44E-03 1.68E-04 8.90E-03 7.97E-03 5.00E-02 PASS 8.48E-03 1.76E-04 8.97E-03 8.00E-03 5.00E-02 PASS 8.61E-03 7.49E-05 8.81E-03 8.40E-03 5.00E-02 PASS 8.89E-03 2.35E-04 9.54E-03 8.25E-03 5.00E-02 PASS 9.21E-03 2.76E-04 9.96E-03 8.45E-03 5.00E-02 PASS 9.73E-03 1.74E-04 1.02E-02 9.25E-03 5.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 30 200 9.10E-03 9.37E-03 8.77E-03 9.09E-03 8.83E-03 9.60E-03 9.53E-03 9.96E-03 9.84E-03 9.73E-03 8.41E-03 8.19E-03 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.20E-01 VOL @ +/-2.5V IL=5MA 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.13. Plot of VOL @ +/-2.5V IL=5MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 31 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.13. Raw data for VOL @ +/-2.5V IL=5MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOL @ +/-2.5V IL=5MA Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 5.60E-02 5.64E-02 5.69E-02 5.57E-02 5.58E-02 5.66E-02 5.46E-02 5.50E-02 5.56E-02 5.47E-02 5.50E-02 5.56E-02 5.43E-02 5.46E-02 5.52E-02 5.62E-02 5.70E-02 5.81E-02 5.49E-02 5.55E-02 5.62E-02 5.56E-02 5.59E-02 5.66E-02 5.51E-02 5.58E-02 5.63E-02 5.50E-02 5.55E-02 5.63E-02 5.43E-02 5.42E-02 5.45E-02 5.43E-02 5.44E-02 5.44E-02 0 5.54E-02 5.56E-02 5.44E-02 5.46E-02 5.43E-02 5.58E-02 5.47E-02 5.50E-02 5.51E-02 5.52E-02 5.48E-02 5.48E-02 10 5.54E-02 5.51E-02 5.46E-02 5.46E-02 5.41E-02 5.62E-02 5.49E-02 5.51E-02 5.48E-02 5.49E-02 5.41E-02 5.43E-02 5.49E-02 5.85E-04 5.65E-02 5.33E-02 5.48E-02 5.16E-04 5.62E-02 5.33E-02 5.51E-02 7.50E-04 5.71E-02 5.30E-02 5.54E-02 7.08E-04 5.73E-02 5.34E-02 5.60E-02 7.44E-04 5.80E-02 5.39E-02 5.65E-02 7.39E-04 5.85E-02 5.45E-02 5.52E-02 4.23E-04 5.63E-02 5.40E-02 1.00E-01 PASS 5.52E-02 6.13E-04 5.68E-02 5.35E-02 1.00E-01 PASS 5.54E-02 5.45E-04 5.69E-02 5.39E-02 1.00E-01 PASS 5.60E-02 6.21E-04 5.77E-02 5.43E-02 1.00E-01 PASS 5.67E-02 7.96E-04 5.89E-02 5.45E-02 1.00E-01 PASS 5.74E-02 2.91E-04 5.82E-02 5.66E-02 1.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 32 200 5.74E-02 5.71E-02 5.61E-02 5.62E-02 5.57E-02 5.76E-02 5.74E-02 5.77E-02 5.74E-02 5.69E-02 5.40E-02 5.45E-02 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 3.50E-01 VOL @ +/-2.5V IL=20MA 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.14. Plot of VOL @ +/-2.5V IL=20MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 33 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.14. Raw data for VOL @ +/-2.5V IL=20MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOL @ +/-2.5V IL=20MA Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.64E-01 1.65E-01 1.67E-01 1.64E-01 1.64E-01 1.66E-01 1.61E-01 1.61E-01 1.62E-01 1.61E-01 1.62E-01 1.63E-01 1.60E-01 1.61E-01 1.62E-01 1.66E-01 1.67E-01 1.69E-01 1.62E-01 1.63E-01 1.64E-01 1.63E-01 1.64E-01 1.65E-01 1.62E-01 1.63E-01 1.64E-01 1.61E-01 1.62E-01 1.63E-01 1.60E-01 1.60E-01 1.60E-01 1.60E-01 1.61E-01 1.60E-01 0 1.63E-01 1.64E-01 1.60E-01 1.61E-01 1.60E-01 1.66E-01 1.62E-01 1.62E-01 1.62E-01 1.61E-01 1.61E-01 1.62E-01 10 1.63E-01 1.63E-01 1.60E-01 1.61E-01 1.60E-01 1.66E-01 1.62E-01 1.62E-01 1.61E-01 1.60E-01 1.60E-01 1.60E-01 1.62E-01 1.77E-03 1.66E-01 1.57E-01 1.62E-01 1.73E-03 1.66E-01 1.57E-01 1.62E-01 1.78E-03 1.67E-01 1.57E-01 1.63E-01 1.84E-03 1.68E-01 1.58E-01 1.64E-01 2.13E-03 1.70E-01 1.58E-01 1.65E-01 1.89E-03 1.70E-01 1.60E-01 1.63E-01 1.67E-03 1.67E-01 1.58E-01 2.90E-01 PASS 1.62E-01 2.05E-03 1.68E-01 1.57E-01 2.90E-01 PASS 1.63E-01 2.05E-03 1.68E-01 1.57E-01 2.90E-01 PASS 1.64E-01 1.99E-03 1.69E-01 1.58E-01 2.90E-01 PASS 1.65E-01 2.31E-03 1.71E-01 1.59E-01 2.90E-01 PASS 1.66E-01 1.67E-03 1.71E-01 1.62E-01 2.90E-01 PASS An ISO 9001:2008 and DSCC Certified Company 34 200 1.67E-01 1.66E-01 1.64E-01 1.64E-01 1.63E-01 1.69E-01 1.66E-01 1.67E-01 1.65E-01 1.64E-01 1.60E-01 1.60E-01 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 0.00E+00 -1.00E-02 ISC SOURCE @ +/-2.5V -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 -9.00E-02 -1.00E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.15. Plot of ISC SOURCE @ +/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 35 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.15. Raw data for ISC SOURCE @ +/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). ISC SOURCE @ +/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -8.89E-02 -8.93E-02 -9.60E-02 -9.58E-02 -9.51E-02 -8.59E-02 -9.45E-02 -9.12E-02 -9.37E-02 -9.47E-02 -9.55E-02 -9.52E-02 10 -8.92E-02 -8.98E-02 -9.61E-02 -9.59E-02 -9.52E-02 -8.62E-02 -9.47E-02 -9.14E-02 -9.43E-02 -9.52E-02 -9.60E-02 -9.59E-02 Total Dose (krad(Si)) 20 50 -8.90E-02 -8.89E-02 -8.96E-02 -8.96E-02 -9.60E-02 -9.60E-02 -9.59E-02 -9.58E-02 -9.51E-02 -9.50E-02 -8.61E-02 -8.60E-02 -9.47E-02 -9.45E-02 -9.12E-02 -9.12E-02 -9.42E-02 -9.41E-02 -9.51E-02 -9.50E-02 -9.59E-02 -9.59E-02 -9.59E-02 -9.57E-02 100 -8.85E-02 -8.93E-02 -9.57E-02 -9.55E-02 -9.48E-02 -8.57E-02 -9.44E-02 -9.11E-02 -9.40E-02 -9.49E-02 -9.59E-02 -9.59E-02 200 -8.86E-02 -8.92E-02 -9.55E-02 -9.54E-02 -9.45E-02 -8.57E-02 -9.43E-02 -9.09E-02 -9.38E-02 -9.47E-02 -9.59E-02 -9.59E-02 -9.30E-02 3.58E-03 -8.32E-02 -1.03E-01 -9.32E-02 3.46E-03 -8.38E-02 -1.03E-01 -9.31E-02 3.51E-03 -8.35E-02 -1.03E-01 -9.31E-02 3.51E-03 -8.34E-02 -1.03E-01 -9.28E-02 3.58E-03 -8.30E-02 -1.03E-01 -9.26E-02 3.43E-03 -8.32E-02 -1.02E-01 -9.20E-02 3.67E-03 -8.20E-02 -1.02E-01 -6.00E-02 PASS -9.23E-02 3.75E-03 -8.21E-02 -1.03E-01 -6.00E-02 PASS -9.22E-02 3.78E-03 -8.19E-02 -1.03E-01 -6.00E-02 PASS -9.22E-02 3.75E-03 -8.19E-02 -1.02E-01 -6.00E-02 PASS -9.20E-02 3.84E-03 -8.15E-02 -1.03E-01 -6.00E-02 PASS -9.19E-02 3.76E-03 -8.16E-02 -1.02E-01 -6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 36 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 9.00E-02 8.00E-02 ISC SINK @ +/-2.5V 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.16. Plot of ISC SINK @ +/-2.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 37 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.16. Raw data for ISC SINK @ +/-2.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). ISC SINK @ +/-2.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 20 50 100 8.12E-02 8.09E-02 8.07E-02 8.14E-02 8.12E-02 8.10E-02 8.25E-02 8.23E-02 8.20E-02 8.27E-02 8.25E-02 8.22E-02 8.34E-02 8.32E-02 8.29E-02 8.01E-02 7.99E-02 7.97E-02 8.18E-02 8.16E-02 8.12E-02 8.14E-02 8.11E-02 8.08E-02 8.21E-02 8.19E-02 8.15E-02 8.21E-02 8.18E-02 8.16E-02 8.30E-02 8.30E-02 8.30E-02 8.25E-02 8.27E-02 8.26E-02 0 8.14E-02 8.18E-02 8.28E-02 8.30E-02 8.37E-02 8.03E-02 8.20E-02 8.16E-02 8.26E-02 8.24E-02 8.32E-02 8.29E-02 10 8.11E-02 8.14E-02 8.25E-02 8.28E-02 8.35E-02 8.01E-02 8.19E-02 8.14E-02 8.22E-02 8.21E-02 8.29E-02 8.25E-02 8.26E-02 9.27E-04 8.51E-02 8.00E-02 8.22E-02 9.80E-04 8.49E-02 7.96E-02 8.22E-02 9.37E-04 8.48E-02 7.97E-02 8.20E-02 9.61E-04 8.46E-02 7.94E-02 8.18E-02 9.02E-04 8.42E-02 7.93E-02 8.11E-02 9.55E-04 8.37E-02 7.85E-02 8.18E-02 9.28E-04 8.43E-02 7.92E-02 6.00E-02 PASS 8.16E-02 8.71E-04 8.39E-02 7.92E-02 6.00E-02 PASS 8.15E-02 8.16E-04 8.37E-02 7.93E-02 6.00E-02 PASS 8.13E-02 8.26E-04 8.35E-02 7.90E-02 6.00E-02 PASS 8.10E-02 7.87E-04 8.31E-02 7.88E-02 6.00E-02 PASS 8.05E-02 6.81E-04 8.24E-02 7.86E-02 6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 38 200 7.99E-02 8.05E-02 8.14E-02 8.15E-02 8.23E-02 7.94E-02 8.07E-02 8.03E-02 8.10E-02 8.11E-02 8.29E-02 8.25E-02 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased + SUPPLY CURRENT @ +/-5V 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.17. Plot of + SUPPLY CURRENT @ +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 39 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.17. Raw data for + SUPPLY CURRENT @ +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). + SUPPLY CURRENT @ +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.96E-02 1.96E-02 1.95E-02 1.96E-02 1.96E-02 1.96E-02 1.94E-02 1.95E-02 1.93E-02 2.00E-02 2.00E-02 1.98E-02 1.96E-02 1.97E-02 1.95E-02 1.98E-02 1.98E-02 1.99E-02 1.93E-02 1.93E-02 1.93E-02 2.03E-02 2.03E-02 2.02E-02 2.02E-02 2.02E-02 2.01E-02 2.02E-02 2.02E-02 2.02E-02 1.97E-02 1.98E-02 1.98E-02 1.98E-02 2.00E-02 1.99E-02 0 1.97E-02 1.99E-02 1.96E-02 2.02E-02 1.98E-02 1.98E-02 1.94E-02 2.03E-02 2.05E-02 2.05E-02 2.00E-02 2.03E-02 10 1.95E-02 1.96E-02 1.95E-02 2.00E-02 1.97E-02 1.97E-02 1.94E-02 2.02E-02 2.02E-02 2.02E-02 1.97E-02 1.98E-02 1.98E-02 2.07E-04 2.04E-02 1.93E-02 1.97E-02 2.11E-04 2.02E-02 1.91E-02 1.97E-02 2.03E-04 2.02E-02 1.91E-02 1.97E-02 2.10E-04 2.03E-02 1.91E-02 1.95E-02 1.71E-04 2.00E-02 1.91E-02 1.87E-02 2.64E-04 1.95E-02 1.80E-02 2.01E-02 4.65E-04 2.14E-02 1.88E-02 2.90E-02 PASS 1.99E-02 3.77E-04 2.10E-02 1.89E-02 2.90E-02 PASS 2.00E-02 4.03E-04 2.11E-02 1.89E-02 2.90E-02 PASS 1.99E-02 3.97E-04 2.10E-02 1.89E-02 2.90E-02 PASS 1.99E-02 3.88E-04 2.10E-02 1.89E-02 2.90E-02 PASS 1.98E-02 4.04E-04 2.09E-02 1.87E-02 2.90E-02 PASS An ISO 9001:2008 and DSCC Certified Company 40 200 1.86E-02 1.92E-02 1.85E-02 1.89E-02 1.86E-02 1.97E-02 1.91E-02 2.01E-02 1.99E-02 2.00E-02 1.97E-02 1.99E-02 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 - SUPPLY CURRENT @ +/-5V -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.18. Plot of - SUPPLY CURRENT @ +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 41 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.18. Raw data for - SUPPLY CURRENT @ +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). - SUPPLY CURRENT @ +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.98E-02 -2.00E-02 -1.97E-02 -2.02E-02 -1.99E-02 -1.99E-02 -1.95E-02 -2.04E-02 -2.06E-02 -2.05E-02 -2.01E-02 -2.03E-02 10 -1.96E-02 -1.96E-02 -1.95E-02 -2.01E-02 -1.97E-02 -1.98E-02 -1.94E-02 -2.03E-02 -2.02E-02 -2.02E-02 -1.98E-02 -1.99E-02 Total Dose (krad(Si)) 20 50 -1.97E-02 -1.97E-02 -1.97E-02 -1.96E-02 -1.95E-02 -1.95E-02 -2.01E-02 -2.01E-02 -1.97E-02 -1.98E-02 -1.99E-02 -1.98E-02 -1.94E-02 -1.94E-02 -2.04E-02 -2.03E-02 -2.02E-02 -2.02E-02 -2.03E-02 -2.03E-02 -1.98E-02 -1.98E-02 -1.99E-02 -2.00E-02 100 -1.95E-02 -1.96E-02 -1.94E-02 -1.98E-02 -1.96E-02 -1.99E-02 -1.93E-02 -2.03E-02 -2.02E-02 -2.02E-02 -1.98E-02 -1.99E-02 200 -1.86E-02 -1.92E-02 -1.86E-02 -1.89E-02 -1.86E-02 -1.98E-02 -1.91E-02 -2.01E-02 -2.00E-02 -2.01E-02 -1.98E-02 -1.99E-02 -1.99E-02 2.07E-04 -1.93E-02 -2.05E-02 -1.97E-02 2.10E-04 -1.91E-02 -2.03E-02 -1.97E-02 2.07E-04 -1.92E-02 -2.03E-02 -1.97E-02 2.10E-04 -1.92E-02 -2.03E-02 -1.96E-02 1.73E-04 -1.91E-02 -2.01E-02 -1.88E-02 2.66E-04 -1.81E-02 -1.95E-02 -2.02E-02 4.64E-04 -1.89E-02 -2.15E-02 -2.90E-02 PASS -2.00E-02 3.80E-04 -1.90E-02 -2.10E-02 -2.90E-02 PASS -2.00E-02 4.08E-04 -1.89E-02 -2.11E-02 -2.90E-02 PASS -2.00E-02 4.01E-04 -1.89E-02 -2.11E-02 -2.90E-02 PASS -2.00E-02 3.95E-04 -1.89E-02 -2.11E-02 -2.90E-02 PASS -1.98E-02 4.16E-04 -1.87E-02 -2.10E-02 -2.90E-02 PASS An ISO 9001:2008 and DSCC Certified Company 42 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased + S/D SUPPLY CURRENT @ +/-5V 2.50E-03 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.19. Plot of + S/D SUPPLY CURRENT @ +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 43 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.19. Raw data for + S/D SUPPLY CURRENT @ +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). + S/D SUPPLY CURRENT @ +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.50E-03 1.50E-03 1.48E-03 1.50E-03 1.49E-03 1.47E-03 1.51E-03 1.50E-03 1.48E-03 1.53E-03 1.52E-03 1.50E-03 1.50E-03 1.49E-03 1.47E-03 1.51E-03 1.51E-03 1.50E-03 1.52E-03 1.52E-03 1.51E-03 1.53E-03 1.53E-03 1.52E-03 1.53E-03 1.53E-03 1.52E-03 1.52E-03 1.52E-03 1.51E-03 1.62E-03 1.62E-03 1.62E-03 1.52E-03 1.52E-03 1.52E-03 0 1.53E-03 1.52E-03 1.53E-03 1.55E-03 1.52E-03 1.52E-03 1.53E-03 1.54E-03 1.54E-03 1.53E-03 1.63E-03 1.52E-03 10 1.51E-03 1.51E-03 1.52E-03 1.54E-03 1.51E-03 1.51E-03 1.53E-03 1.53E-03 1.54E-03 1.53E-03 1.62E-03 1.52E-03 1.53E-03 1.36E-05 1.57E-03 1.49E-03 1.52E-03 1.39E-05 1.56E-03 1.48E-03 1.51E-03 1.35E-05 1.54E-03 1.47E-03 1.50E-03 1.29E-05 1.54E-03 1.47E-03 1.48E-03 1.19E-05 1.51E-03 1.45E-03 1.43E-03 1.01E-05 1.45E-03 1.40E-03 1.53E-03 9.46E-06 1.56E-03 1.51E-03 2.10E-03 PASS 1.53E-03 8.88E-06 1.55E-03 1.50E-03 2.10E-03 PASS 1.52E-03 8.02E-06 1.55E-03 1.50E-03 2.10E-03 PASS 1.52E-03 8.31E-06 1.54E-03 1.50E-03 2.10E-03 PASS 1.51E-03 8.02E-06 1.54E-03 1.49E-03 2.10E-03 PASS 1.50E-03 5.85E-06 1.51E-03 1.48E-03 2.10E-03 PASS An ISO 9001:2008 and DSCC Certified Company 44 200 1.42E-03 1.43E-03 1.43E-03 1.44E-03 1.42E-03 1.49E-03 1.49E-03 1.50E-03 1.50E-03 1.50E-03 1.62E-03 1.52E-03 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 S/D PIN CURRENT @ +/-5V -5.00E-05 -1.00E-04 -1.50E-04 -2.00E-04 -2.50E-04 -3.00E-04 -3.50E-04 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.20. Plot of S/D PIN CURRENT @ +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 45 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.20. Raw data for S/D PIN CURRENT @ +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). S/D PIN CURRENT @ +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -1.95E-04 -1.95E-04 -1.94E-04 -1.96E-04 -1.93E-04 -1.94E-04 -1.95E-04 -1.95E-04 -1.95E-04 -1.94E-04 -1.94E-04 -1.94E-04 10 -1.94E-04 -1.94E-04 -1.94E-04 -1.95E-04 -1.93E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.94E-04 -1.93E-04 Total Dose (krad(Si)) 20 50 -1.94E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.94E-04 -1.93E-04 -1.95E-04 -1.95E-04 -1.93E-04 -1.92E-04 -1.94E-04 -1.93E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.93E-04 -1.94E-04 -1.94E-04 -1.93E-04 -1.93E-04 100 -1.93E-04 -1.93E-04 -1.92E-04 -1.94E-04 -1.92E-04 -1.93E-04 -1.93E-04 -1.93E-04 -1.93E-04 -1.92E-04 -1.94E-04 -1.93E-04 200 -1.91E-04 -1.91E-04 -1.91E-04 -1.92E-04 -1.90E-04 -1.92E-04 -1.92E-04 -1.92E-04 -1.92E-04 -1.91E-04 -1.94E-04 -1.93E-04 -1.95E-04 8.35E-07 -1.92E-04 -1.97E-04 -1.94E-04 8.10E-07 -1.92E-04 -1.96E-04 -1.94E-04 8.10E-07 -1.92E-04 -1.96E-04 -1.93E-04 8.23E-07 -1.91E-04 -1.96E-04 -1.93E-04 7.45E-07 -1.91E-04 -1.95E-04 -1.91E-04 6.78E-07 -1.89E-04 -1.93E-04 -1.95E-04 4.60E-07 -1.93E-04 -1.96E-04 -2.95E-04 PASS -1.94E-04 4.89E-07 -1.93E-04 -1.95E-04 -2.95E-04 PASS -1.94E-04 4.39E-07 -1.93E-04 -1.95E-04 -2.95E-04 PASS -1.93E-04 4.48E-07 -1.92E-04 -1.95E-04 -2.95E-04 PASS -1.93E-04 4.29E-07 -1.92E-04 -1.94E-04 -2.95E-04 PASS -1.92E-04 5.18E-07 -1.90E-04 -1.93E-04 -2.95E-04 PASS An ISO 9001:2008 and DSCC Certified Company 46 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.40E+02 CMRR @ +/-5V VCM=+/-2V 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.21. Plot of CMRR @ +/-5V VCM=+/-2V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 47 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.21. Raw data for CMRR @ +/-5V VCM=+/-2V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR @ +/-5V VCM=+/-2V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.11E+02 1.10E+02 1.04E+02 1.25E+02 1.09E+02 1.14E+02 1.10E+02 1.27E+02 1.12E+02 1.16E+02 1.26E+02 1.13E+02 10 1.11E+02 1.11E+02 1.04E+02 1.25E+02 1.09E+02 1.14E+02 1.10E+02 1.27E+02 1.12E+02 1.15E+02 1.30E+02 1.14E+02 Total Dose (krad(Si)) 20 50 1.11E+02 1.11E+02 1.10E+02 1.11E+02 1.04E+02 1.04E+02 1.25E+02 1.25E+02 1.09E+02 1.09E+02 1.14E+02 1.14E+02 1.10E+02 1.10E+02 1.27E+02 1.29E+02 1.12E+02 1.12E+02 1.15E+02 1.15E+02 1.28E+02 1.28E+02 1.13E+02 1.13E+02 100 1.10E+02 1.11E+02 1.04E+02 1.24E+02 1.08E+02 1.14E+02 1.10E+02 1.26E+02 1.12E+02 1.16E+02 1.29E+02 1.13E+02 200 1.09E+02 1.11E+02 1.03E+02 1.19E+02 1.07E+02 1.14E+02 1.10E+02 1.27E+02 1.12E+02 1.16E+02 1.27E+02 1.14E+02 1.12E+02 7.91E+00 1.33E+02 9.01E+01 1.12E+02 7.88E+00 1.33E+02 9.02E+01 1.12E+02 7.87E+00 1.33E+02 9.02E+01 1.12E+02 7.97E+00 1.34E+02 9.00E+01 1.12E+02 7.64E+00 1.33E+02 9.06E+01 1.10E+02 5.66E+00 1.25E+02 9.43E+01 1.16E+02 6.68E+00 1.34E+02 9.74E+01 7.50E+01 PASS 1.16E+02 6.76E+00 1.34E+02 9.72E+01 7.50E+01 PASS 1.16E+02 6.52E+00 1.34E+02 9.79E+01 7.50E+01 PASS 1.16E+02 7.65E+00 1.37E+02 9.51E+01 7.50E+01 PASS 1.16E+02 6.26E+00 1.33E+02 9.84E+01 7.50E+01 PASS 1.16E+02 6.73E+00 1.34E+02 9.74E+01 7.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 48 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 1.20E+02 CMRR @ +/-5V VCM=+/-5V 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.22. Plot of CMRR @ +/-5V VCM=+/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 49 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.22. Raw data for CMRR @ +/-5V VCM=+/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). CMRR @ +/-5V VCM=+/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 8.45E+01 8.37E+01 8.21E+01 9.69E+01 8.33E+01 1.24E+02 8.61E+01 8.59E+01 8.85E+01 9.96E+01 8.82E+01 8.65E+01 10 8.46E+01 8.37E+01 8.21E+01 9.70E+01 8.34E+01 1.24E+02 8.61E+01 8.59E+01 8.86E+01 9.94E+01 8.82E+01 8.65E+01 Total Dose (krad(Si)) 20 50 8.45E+01 8.45E+01 8.37E+01 8.37E+01 8.21E+01 8.21E+01 9.70E+01 9.69E+01 8.34E+01 8.34E+01 1.24E+02 1.37E+02 8.61E+01 8.60E+01 8.59E+01 8.58E+01 8.86E+01 8.88E+01 9.93E+01 9.90E+01 8.82E+01 8.82E+01 8.65E+01 8.65E+01 100 8.43E+01 8.36E+01 8.21E+01 9.65E+01 8.33E+01 1.26E+02 8.58E+01 8.56E+01 8.91E+01 9.87E+01 8.82E+01 8.65E+01 200 8.41E+01 8.35E+01 8.21E+01 9.53E+01 8.32E+01 1.29E+02 8.56E+01 8.54E+01 8.94E+01 9.82E+01 8.82E+01 8.65E+01 8.61E+01 6.12E+00 1.03E+02 6.93E+01 8.61E+01 6.12E+00 1.03E+02 6.94E+01 8.61E+01 6.11E+00 1.03E+02 6.94E+01 8.61E+01 6.10E+00 1.03E+02 6.94E+01 8.60E+01 5.93E+00 1.02E+02 6.97E+01 8.56E+01 5.46E+00 1.01E+02 7.07E+01 9.67E+01 1.60E+01 1.41E+02 5.29E+01 6.50E+01 PASS 9.67E+01 1.60E+01 1.41E+02 5.27E+01 6.50E+01 PASS 9.69E+01 1.63E+01 1.42E+02 5.20E+01 6.50E+01 PASS 9.93E+01 2.17E+01 1.59E+02 3.98E+01 6.50E+01 PASS 9.70E+01 1.70E+01 1.44E+02 5.03E+01 6.50E+01 PASS 9.75E+01 1.82E+01 1.48E+02 4.75E+01 6.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 50 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 7.00E+01 PSRR @ +/-1.25V TO +/-5V 6.80E+01 6.60E+01 6.40E+01 6.20E+01 6.00E+01 5.80E+01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.23. Plot of PSRR @ +/-1.25V TO +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 51 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.23. Raw data for PSRR @ +/-1.25V TO +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). PSRR @ +/-1.25V TO +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 6.96E+01 6.96E+01 6.94E+01 6.90E+01 6.94E+01 6.88E+01 6.95E+01 6.89E+01 6.90E+01 6.88E+01 6.94E+01 6.86E+01 10 6.96E+01 6.97E+01 6.94E+01 6.90E+01 6.94E+01 6.89E+01 6.95E+01 6.89E+01 6.91E+01 6.89E+01 6.95E+01 6.87E+01 Total Dose (krad(Si)) 20 50 6.96E+01 6.95E+01 6.97E+01 6.97E+01 6.94E+01 6.94E+01 6.90E+01 6.89E+01 6.94E+01 6.94E+01 6.88E+01 6.88E+01 6.95E+01 6.95E+01 6.89E+01 6.88E+01 6.91E+01 6.90E+01 6.89E+01 6.89E+01 6.95E+01 6.95E+01 6.87E+01 6.87E+01 100 6.93E+01 6.96E+01 6.93E+01 6.88E+01 6.93E+01 6.87E+01 6.94E+01 6.88E+01 6.90E+01 6.88E+01 6.95E+01 6.87E+01 200 6.92E+01 6.94E+01 6.91E+01 6.86E+01 6.90E+01 6.87E+01 6.92E+01 6.87E+01 6.89E+01 6.88E+01 6.95E+01 6.87E+01 6.94E+01 2.54E-01 7.01E+01 6.87E+01 6.94E+01 2.77E-01 7.02E+01 6.87E+01 6.94E+01 2.66E-01 7.01E+01 6.87E+01 6.94E+01 2.69E-01 7.01E+01 6.86E+01 6.93E+01 2.70E-01 7.00E+01 6.85E+01 6.91E+01 3.22E-01 6.99E+01 6.82E+01 6.90E+01 2.73E-01 6.97E+01 6.83E+01 6.00E+01 PASS 6.91E+01 2.70E-01 6.98E+01 6.83E+01 6.00E+01 PASS 6.90E+01 2.80E-01 6.98E+01 6.83E+01 6.00E+01 PASS 6.90E+01 2.77E-01 6.98E+01 6.82E+01 6.00E+01 PASS 6.89E+01 2.71E-01 6.97E+01 6.82E+01 6.00E+01 PASS 6.88E+01 2.35E-01 6.95E+01 6.82E+01 6.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 52 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 2.00E+02 AVOL @ +/-5V RL=1K VO=+/-4.5V 1.80E+02 1.60E+02 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.24. Plot of AVOL @ +/-5V RL=1K VO=+/-4.5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 53 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.24. Raw data for AVOL @ +/-5V RL=1K VO=+/-4.5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL @ +/-5V RL=1K VO=+/-4.5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 1.79E+02 1.76E+02 1.75E+02 1.73E+02 1.79E+02 1.71E+02 1.74E+02 1.74E+02 1.73E+02 1.74E+02 1.78E+02 1.74E+02 10 1.74E+02 1.77E+02 1.75E+02 1.75E+02 1.78E+02 1.72E+02 1.76E+02 1.75E+02 1.80E+02 1.79E+02 1.77E+02 1.75E+02 Total Dose (krad(Si)) 20 50 1.75E+02 1.78E+02 1.80E+02 1.78E+02 1.75E+02 1.76E+02 1.74E+02 1.75E+02 1.80E+02 1.76E+02 1.72E+02 1.73E+02 1.79E+02 1.75E+02 1.75E+02 1.70E+02 1.78E+02 1.78E+02 1.75E+02 1.75E+02 1.80E+02 1.81E+02 1.76E+02 1.75E+02 100 1.79E+02 1.77E+02 1.74E+02 1.72E+02 1.75E+02 1.65E+02 1.79E+02 1.70E+02 1.76E+02 1.74E+02 1.79E+02 1.77E+02 200 1.74E+02 1.76E+02 1.64E+02 1.50E+02 1.75E+02 1.54E+02 1.75E+02 1.66E+02 1.65E+02 1.74E+02 1.78E+02 1.74E+02 1.76E+02 2.31E+00 1.83E+02 1.70E+02 1.76E+02 1.64E+00 1.80E+02 1.71E+02 1.77E+02 2.99E+00 1.85E+02 1.69E+02 1.77E+02 1.24E+00 1.80E+02 1.73E+02 1.75E+02 2.57E+00 1.82E+02 1.68E+02 1.68E+02 1.14E+01 1.99E+02 1.37E+02 1.73E+02 1.36E+00 1.77E+02 1.70E+02 4.60E+01 PASS 1.76E+02 3.05E+00 1.85E+02 1.68E+02 4.60E+01 PASS 1.76E+02 2.72E+00 1.83E+02 1.68E+02 4.60E+01 PASS 1.74E+02 3.21E+00 1.83E+02 1.65E+02 4.60E+01 PASS 1.73E+02 5.45E+00 1.88E+02 1.58E+02 4.60E+01 PASS 1.67E+02 8.46E+00 1.90E+02 1.43E+02 4.60E+01 PASS An ISO 9001:2008 and DSCC Certified Company 54 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased AVOL @ +/-5V RL=100 VO=+/-2V 3.00E+01 2.50E+01 2.00E+01 1.50E+01 1.00E+01 5.00E+00 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.25. Plot of AVOL @ +/-5V RL=100 VO=+/-2V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 55 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.25. Raw data for AVOL @ +/-5V RL=100 VO=+/-2V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). AVOL @ +/-5V RL=100 VO=+/-2V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 2.65E+01 2.65E+01 2.63E+01 2.52E+01 2.65E+01 2.45E+01 2.66E+01 2.48E+01 2.49E+01 2.47E+01 2.64E+01 2.45E+01 10 2.65E+01 2.64E+01 2.64E+01 2.53E+01 2.65E+01 2.46E+01 2.65E+01 2.48E+01 2.56E+01 2.50E+01 2.66E+01 2.46E+01 Total Dose (krad(Si)) 20 50 2.65E+01 2.65E+01 2.64E+01 2.63E+01 2.63E+01 2.63E+01 2.51E+01 2.54E+01 2.65E+01 2.65E+01 2.47E+01 2.45E+01 2.66E+01 2.65E+01 2.46E+01 2.46E+01 2.51E+01 2.51E+01 2.48E+01 2.47E+01 2.66E+01 2.64E+01 2.47E+01 2.46E+01 100 2.58E+01 2.65E+01 2.63E+01 2.44E+01 2.64E+01 2.37E+01 2.65E+01 2.46E+01 2.46E+01 2.46E+01 2.65E+01 2.47E+01 200 2.46E+01 2.59E+01 2.45E+01 2.28E+01 2.45E+01 2.35E+01 2.53E+01 2.44E+01 2.47E+01 2.45E+01 2.64E+01 2.45E+01 2.62E+01 5.66E-01 2.78E+01 2.46E+01 2.62E+01 5.17E-01 2.76E+01 2.48E+01 2.62E+01 5.98E-01 2.78E+01 2.45E+01 2.62E+01 4.58E-01 2.75E+01 2.49E+01 2.59E+01 8.70E-01 2.83E+01 2.35E+01 2.45E+01 1.10E+00 2.75E+01 2.14E+01 2.51E+01 8.51E-01 2.74E+01 2.28E+01 7.50E+00 PASS 2.53E+01 7.68E-01 2.74E+01 2.32E+01 7.50E+00 PASS 2.52E+01 8.26E-01 2.74E+01 2.29E+01 7.50E+00 PASS 2.51E+01 8.26E-01 2.73E+01 2.28E+01 7.50E+00 PASS 2.48E+01 1.03E+00 2.76E+01 2.20E+01 7.50E+00 PASS 2.45E+01 6.50E-01 2.63E+01 2.27E+01 7.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 56 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 -2.00E-02 VOH @ +/-5V IL=0 -4.00E-02 -6.00E-02 -8.00E-02 -1.00E-01 -1.20E-01 -1.40E-01 -1.60E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.26. Plot of VOH @ +/-5V IL=0 versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 57 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.26. Raw data for VOH @ +/-5V IL=0 versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOH @ +/-5V IL=0 Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -5.83E-02 -5.95E-02 -5.93E-02 -5.73E-02 -5.90E-02 -5.80E-02 -5.75E-02 -5.79E-02 -5.97E-02 -5.99E-02 -5.96E-02 -5.96E-02 10 -5.76E-02 -5.82E-02 -5.88E-02 -5.69E-02 -5.85E-02 -5.73E-02 -5.71E-02 -5.74E-02 -5.85E-02 -5.87E-02 -5.85E-02 -5.79E-02 Total Dose (krad(Si)) 20 50 -5.79E-02 -5.77E-02 -5.86E-02 -5.82E-02 -5.88E-02 -5.87E-02 -5.69E-02 -5.68E-02 -5.85E-02 -5.83E-02 -5.76E-02 -5.74E-02 -5.69E-02 -5.66E-02 -5.77E-02 -5.74E-02 -5.85E-02 -5.85E-02 -5.88E-02 -5.86E-02 -5.84E-02 -5.86E-02 -5.76E-02 -5.83E-02 100 -5.83E-02 -5.86E-02 -5.85E-02 -5.68E-02 -5.83E-02 -5.79E-02 -5.67E-02 -5.71E-02 -5.81E-02 -5.85E-02 -5.88E-02 -5.82E-02 200 -5.64E-02 -5.76E-02 -5.76E-02 -5.57E-02 -5.74E-02 -5.73E-02 -5.62E-02 -5.68E-02 -5.76E-02 -5.78E-02 -5.89E-02 -5.80E-02 -5.87E-02 8.90E-04 -5.62E-02 -6.11E-02 -5.80E-02 7.82E-04 -5.59E-02 -6.01E-02 -5.81E-02 7.79E-04 -5.60E-02 -6.03E-02 -5.79E-02 7.33E-04 -5.59E-02 -6.00E-02 -5.81E-02 7.17E-04 -5.61E-02 -6.01E-02 -5.69E-02 8.66E-04 -5.46E-02 -5.93E-02 -5.86E-02 1.11E-03 -5.55E-02 -6.16E-02 -1.50E-01 PASS -5.78E-02 7.51E-04 -5.57E-02 -5.98E-02 -1.50E-01 PASS -5.79E-02 7.61E-04 -5.58E-02 -6.00E-02 -1.50E-01 PASS -5.77E-02 8.42E-04 -5.54E-02 -6.00E-02 -1.50E-01 PASS -5.77E-02 7.59E-04 -5.56E-02 -5.98E-02 -1.50E-01 PASS -5.71E-02 6.52E-04 -5.54E-02 -5.89E-02 -1.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 58 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 0.00E+00 VOH @ +/-5V IL=5MA -5.00E-02 -1.00E-01 -1.50E-01 -2.00E-01 -2.50E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.27. Plot of VOH @ +/-5V IL=5MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 59 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.27. Raw data for VOH @ +/-5V IL=5MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOH @ +/-5V IL=5MA Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 0 -9.35E-02 -9.44E-02 -9.29E-02 -9.16E-02 -9.25E-02 -9.36E-02 -9.13E-02 -9.24E-02 -9.39E-02 -9.37E-02 -9.32E-02 -9.33E-02 10 -9.28E-02 -9.33E-02 -9.24E-02 -9.11E-02 -9.22E-02 -9.33E-02 -9.12E-02 -9.23E-02 -9.29E-02 -9.27E-02 -9.21E-02 -9.14E-02 Total Dose (krad(Si)) 20 50 -9.35E-02 -9.35E-02 -9.38E-02 -9.37E-02 -9.28E-02 -9.24E-02 -9.13E-02 -9.11E-02 -9.26E-02 -9.25E-02 -9.35E-02 -9.32E-02 -9.10E-02 -9.11E-02 -9.23E-02 -9.23E-02 -9.28E-02 -9.27E-02 -9.28E-02 -9.26E-02 -9.19E-02 -9.22E-02 -9.13E-02 -9.19E-02 100 -9.43E-02 -9.43E-02 -9.27E-02 -9.15E-02 -9.25E-02 -9.38E-02 -9.13E-02 -9.25E-02 -9.25E-02 -9.29E-02 -9.23E-02 -9.18E-02 200 -9.26E-02 -9.36E-02 -9.19E-02 -9.04E-02 -9.19E-02 -9.36E-02 -9.08E-02 -9.23E-02 -9.23E-02 -9.26E-02 -9.23E-02 -9.17E-02 -9.30E-02 1.06E-03 -9.01E-02 -9.59E-02 -9.24E-02 8.37E-04 -9.01E-02 -9.46E-02 -9.28E-02 9.82E-04 -9.01E-02 -9.55E-02 -9.27E-02 1.03E-03 -8.98E-02 -9.55E-02 -9.30E-02 1.21E-03 -8.97E-02 -9.64E-02 -9.21E-02 1.17E-03 -8.88E-02 -9.53E-02 -9.30E-02 1.08E-03 -9.00E-02 -9.60E-02 -2.30E-01 PASS -9.25E-02 8.13E-04 -9.02E-02 -9.47E-02 -2.30E-01 PASS -9.25E-02 9.13E-04 -9.00E-02 -9.50E-02 -2.30E-01 PASS -9.24E-02 7.86E-04 -9.02E-02 -9.45E-02 -2.30E-01 PASS -9.26E-02 8.99E-04 -9.01E-02 -9.51E-02 -2.30E-01 PASS -9.23E-02 1.03E-03 -8.95E-02 -9.51E-02 -2.30E-01 PASS An ISO 9001:2008 and DSCC Certified Company 60 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 3.00E-01 2.00E-01 VOH @ +/-5V IL=20MA 1.00E-01 0.00E+00 -1.00E-01 -2.00E-01 -3.00E-01 -4.00E-01 -5.00E-01 -6.00E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.28. Plot of VOH @ +/-5V IL=20MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 61 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.28. Raw data for VOH @ +/-5V IL=20MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOH @ +/-5V IL=20MA Device 1 2 3 4 5 6 7 8 9 10 11 12 0 2.06E-01 2.07E-01 1.99E-01 1.99E-01 1.99E-01 2.09E-01 1.99E-01 2.03E-01 2.02E-01 2.00E-01 2.00E-01 2.00E-01 10 2.06E-01 2.05E-01 1.99E-01 1.99E-01 1.99E-01 2.09E-01 1.99E-01 2.03E-01 2.01E-01 1.99E-01 1.98E-01 1.98E-01 Biased Statistics Average Biased 2.02E-01 2.02E-01 Std Dev Biased 4.03E-03 3.65E-03 Ps90%/90% (+KTL) Biased 2.13E-01 2.12E-01 Ps90%/90% (-KTL) Biased 1.91E-01 1.92E-01 Un-Biased Statistics Average Un-Biased 2.03E-01 2.02E-01 Std Dev Un-Biased 3.69E-03 4.05E-03 Ps90%/90% (+KTL) Un-Biased 2.13E-01 2.13E-01 Ps90%/90% (-KTL) Un-Biased 1.93E-01 1.91E-01 Specification MIN -4.80E-01 -4.80E-01 Status PASS PASS Total Dose (krad(Si)) 20 50 2.07E-01 2.08E-01 2.07E-01 2.07E-01 1.99E-01 2.00E-01 2.00E-01 2.01E-01 2.00E-01 2.01E-01 2.09E-01 2.10E-01 2.00E-01 2.00E-01 2.04E-01 2.04E-01 2.01E-01 2.01E-01 2.00E-01 2.00E-01 1.98E-01 1.98E-01 1.97E-01 1.98E-01 100 2.10E-01 2.09E-01 2.01E-01 2.02E-01 2.01E-01 2.11E-01 2.00E-01 2.04E-01 2.02E-01 2.01E-01 1.98E-01 1.98E-01 200 2.09E-01 2.08E-01 2.01E-01 2.01E-01 2.01E-01 2.11E-01 2.01E-01 2.05E-01 2.02E-01 2.01E-01 1.99E-01 1.98E-01 2.03E-01 4.06E-03 2.14E-01 1.92E-01 2.03E-01 3.85E-03 2.14E-01 1.93E-01 2.04E-01 4.44E-03 2.17E-01 1.92E-01 2.04E-01 4.11E-03 2.15E-01 1.93E-01 2.03E-01 4.17E-03 2.14E-01 1.91E-01 -4.80E-01 PASS 2.03E-01 4.02E-03 2.14E-01 1.92E-01 -4.80E-01 PASS 2.04E-01 4.40E-03 2.16E-01 1.92E-01 -4.80E-01 PASS 2.04E-01 4.35E-03 2.16E-01 1.92E-01 -4.80E-01 PASS An ISO 9001:2008 and DSCC Certified Company 62 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 8.00E-02 7.00E-02 VOL @ +/-5V IL=0 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.29. Plot of VOL @ +/-5V IL=0 versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 63 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.29. Raw data for VOL @ +/-5V IL=0 versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOL @ +/-5V IL=0 Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.04E-02 1.05E-02 1.07E-02 1.05E-02 1.06E-02 1.11E-02 1.04E-02 1.05E-02 1.09E-02 1.05E-02 1.07E-02 1.08E-02 1.04E-02 1.05E-02 1.09E-02 1.08E-02 1.11E-02 1.16E-02 1.04E-02 1.05E-02 1.10E-02 1.09E-02 1.12E-02 1.14E-02 1.08E-02 1.12E-02 1.14E-02 1.08E-02 1.10E-02 1.15E-02 1.02E-02 1.04E-02 1.02E-02 1.04E-02 1.03E-02 1.05E-02 0 1.04E-02 1.06E-02 1.02E-02 1.06E-02 1.02E-02 1.03E-02 1.01E-02 1.07E-02 1.08E-02 1.07E-02 1.04E-02 1.05E-02 10 1.04E-02 1.05E-02 1.01E-02 1.02E-02 1.04E-02 1.05E-02 1.02E-02 1.07E-02 1.07E-02 1.07E-02 1.02E-02 1.05E-02 1.04E-02 2.06E-04 1.10E-02 9.85E-03 1.03E-02 1.47E-04 1.07E-02 9.91E-03 1.04E-02 6.57E-05 1.06E-02 1.02E-02 1.06E-02 1.14E-04 1.09E-02 1.02E-02 1.09E-02 1.38E-04 1.12E-02 1.05E-02 1.09E-02 2.70E-04 1.16E-02 1.01E-02 1.05E-02 2.88E-04 1.13E-02 9.73E-03 7.00E-02 PASS 1.06E-02 2.08E-04 1.11E-02 9.99E-03 7.00E-02 PASS 1.07E-02 1.92E-04 1.13E-02 1.02E-02 7.00E-02 PASS 1.10E-02 2.98E-04 1.18E-02 1.02E-02 7.00E-02 PASS 1.14E-02 2.27E-04 1.20E-02 1.08E-02 7.00E-02 PASS 1.17E-02 2.85E-04 1.25E-02 1.10E-02 7.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 64 200 1.09E-02 1.14E-02 1.08E-02 1.07E-02 1.07E-02 1.16E-02 1.14E-02 1.20E-02 1.20E-02 1.16E-02 1.04E-02 1.04E-02 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 1.40E-01 VOL @ +/-5V IL=5MA 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.30. Plot of VOL @ +/-5V IL=5MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 65 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.30. Raw data for VOL @ +/-5V IL=5MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOL @ +/-5V IL=5MA Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 5.71E-02 5.73E-02 5.83E-02 5.69E-02 5.73E-02 5.81E-02 5.61E-02 5.66E-02 5.69E-02 5.64E-02 5.63E-02 5.70E-02 5.56E-02 5.60E-02 5.66E-02 5.76E-02 5.83E-02 5.90E-02 5.64E-02 5.66E-02 5.76E-02 5.69E-02 5.71E-02 5.82E-02 5.65E-02 5.70E-02 5.77E-02 5.66E-02 5.69E-02 5.75E-02 5.59E-02 5.56E-02 5.60E-02 5.59E-02 5.59E-02 5.58E-02 0 5.68E-02 5.68E-02 5.61E-02 5.58E-02 5.56E-02 5.74E-02 5.61E-02 5.65E-02 5.66E-02 5.66E-02 5.59E-02 5.63E-02 10 5.67E-02 5.65E-02 5.57E-02 5.60E-02 5.56E-02 5.76E-02 5.62E-02 5.67E-02 5.62E-02 5.62E-02 5.56E-02 5.56E-02 5.62E-02 5.64E-04 5.77E-02 5.47E-02 5.61E-02 5.00E-04 5.75E-02 5.47E-02 5.64E-02 5.92E-04 5.81E-02 5.48E-02 5.67E-02 5.58E-04 5.82E-02 5.51E-02 5.74E-02 7.50E-04 5.94E-02 5.53E-02 5.79E-02 6.44E-04 5.97E-02 5.61E-02 5.66E-02 4.71E-04 5.79E-02 5.53E-02 1.20E-01 PASS 5.66E-02 6.03E-04 5.82E-02 5.49E-02 1.20E-01 PASS 5.68E-02 5.14E-04 5.82E-02 5.54E-02 1.20E-01 PASS 5.72E-02 6.31E-04 5.89E-02 5.55E-02 1.20E-01 PASS 5.80E-02 6.12E-04 5.97E-02 5.63E-02 1.20E-01 PASS 5.87E-02 3.69E-04 5.98E-02 5.77E-02 1.20E-01 PASS An ISO 9001:2008 and DSCC Certified Company 66 200 5.87E-02 5.85E-02 5.75E-02 5.76E-02 5.72E-02 5.93E-02 5.83E-02 5.89E-02 5.88E-02 5.85E-02 5.59E-02 5.59E-02 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 3.50E-01 VOL @ +/-5V IL=20MA 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.31. Plot of VOL @ +/-5V IL=20MA versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 67 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.31. Raw data for VOL @ +/-5V IL=20MA versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOL @ +/-5V IL=20MA Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status Total Dose (krad(Si)) 20 50 100 1.66E-01 1.67E-01 1.69E-01 1.66E-01 1.66E-01 1.68E-01 1.63E-01 1.64E-01 1.65E-01 1.64E-01 1.64E-01 1.65E-01 1.62E-01 1.63E-01 1.64E-01 1.69E-01 1.69E-01 1.71E-01 1.64E-01 1.65E-01 1.66E-01 1.65E-01 1.66E-01 1.67E-01 1.64E-01 1.65E-01 1.66E-01 1.63E-01 1.64E-01 1.65E-01 1.62E-01 1.62E-01 1.62E-01 1.62E-01 1.63E-01 1.62E-01 0 1.66E-01 1.66E-01 1.62E-01 1.63E-01 1.62E-01 1.68E-01 1.64E-01 1.65E-01 1.64E-01 1.63E-01 1.63E-01 1.63E-01 10 1.66E-01 1.65E-01 1.63E-01 1.63E-01 1.62E-01 1.68E-01 1.64E-01 1.65E-01 1.63E-01 1.63E-01 1.62E-01 1.62E-01 1.64E-01 1.78E-03 1.69E-01 1.59E-01 1.64E-01 1.75E-03 1.69E-01 1.59E-01 1.64E-01 1.77E-03 1.69E-01 1.59E-01 1.65E-01 1.77E-03 1.70E-01 1.60E-01 1.66E-01 2.10E-03 1.72E-01 1.60E-01 1.67E-01 1.82E-03 1.72E-01 1.62E-01 1.65E-01 1.70E-03 1.69E-01 1.60E-01 3.10E-01 PASS 1.65E-01 2.01E-03 1.70E-01 1.59E-01 3.10E-01 PASS 1.65E-01 2.08E-03 1.71E-01 1.59E-01 3.10E-01 PASS 1.66E-01 2.02E-03 1.71E-01 1.60E-01 3.10E-01 PASS 1.67E-01 2.19E-03 1.73E-01 1.61E-01 3.10E-01 PASS 1.68E-01 1.72E-03 1.73E-01 1.64E-01 3.10E-01 PASS An ISO 9001:2008 and DSCC Certified Company 68 200 1.69E-01 1.69E-01 1.66E-01 1.67E-01 1.65E-01 1.71E-01 1.68E-01 1.69E-01 1.68E-01 1.67E-01 1.62E-01 1.63E-01 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 0.00E+00 -1.00E-02 ISC SOURCE @ +/-5V -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 -9.00E-02 -1.00E-01 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.32. Plot of ISC SOURCE @ +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 69 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.32. Raw data for ISC SOURCE @ +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). ISC SOURCE @ +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 0 -8.91E-02 -8.95E-02 -9.61E-02 -9.57E-02 -9.52E-02 -8.64E-02 -9.45E-02 -9.12E-02 -9.38E-02 -9.48E-02 -9.56E-02 -9.54E-02 10 -8.94E-02 -8.99E-02 -9.63E-02 -9.60E-02 -9.54E-02 -8.65E-02 -9.47E-02 -9.13E-02 -9.42E-02 -9.52E-02 -9.61E-02 -9.60E-02 Total Dose (krad(Si)) 20 50 -8.92E-02 -8.92E-02 -8.98E-02 -8.97E-02 -9.62E-02 -9.61E-02 -9.58E-02 -9.58E-02 -9.53E-02 -9.52E-02 -8.65E-02 -8.64E-02 -9.48E-02 -9.46E-02 -9.12E-02 -9.12E-02 -9.42E-02 -9.41E-02 -9.51E-02 -9.50E-02 -9.60E-02 -9.60E-02 -9.60E-02 -9.58E-02 100 -8.88E-02 -8.95E-02 -9.59E-02 -9.56E-02 -9.50E-02 -8.62E-02 -9.46E-02 -9.11E-02 -9.41E-02 -9.50E-02 -9.60E-02 -9.59E-02 200 -8.89E-02 -8.94E-02 -9.57E-02 -9.54E-02 -9.48E-02 -8.62E-02 -9.44E-02 -9.10E-02 -9.39E-02 -9.49E-02 -9.60E-02 -9.59E-02 -9.31E-02 3.51E-03 -8.35E-02 -1.03E-01 -9.34E-02 3.44E-03 -8.39E-02 -1.03E-01 -9.33E-02 3.46E-03 -8.38E-02 -1.03E-01 -9.32E-02 3.44E-03 -8.38E-02 -1.03E-01 -9.30E-02 3.51E-03 -8.33E-02 -1.03E-01 -9.29E-02 3.37E-03 -8.36E-02 -1.02E-01 -9.21E-02 3.51E-03 -8.25E-02 -1.02E-01 -6.00E-02 PASS -9.24E-02 3.64E-03 -8.24E-02 -1.02E-01 -6.00E-02 PASS -9.24E-02 3.64E-03 -8.24E-02 -1.02E-01 -6.00E-02 PASS -9.23E-02 3.62E-03 -8.23E-02 -1.02E-01 -6.00E-02 PASS -9.22E-02 3.68E-03 -8.21E-02 -1.02E-01 -6.00E-02 PASS -9.21E-02 3.65E-03 -8.21E-02 -1.02E-01 -6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 70 RLAT Report 10-447 101221 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased 9.00E-02 8.00E-02 ISC SINK @ +/-5V 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.33. Plot of ISC SINK @ +/-5V versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 71 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.33. Raw data for ISC SINK @ +/-5V versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). ISC SINK @ +/-5V Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Total Dose (krad(Si)) 20 50 100 8.33E-02 8.31E-02 8.26E-02 8.35E-02 8.33E-02 8.31E-02 8.46E-02 8.45E-02 8.42E-02 8.49E-02 8.48E-02 8.43E-02 8.55E-02 8.55E-02 8.51E-02 8.22E-02 8.20E-02 8.18E-02 8.39E-02 8.38E-02 8.35E-02 8.36E-02 8.34E-02 8.31E-02 8.43E-02 8.41E-02 8.38E-02 8.43E-02 8.41E-02 8.39E-02 8.51E-02 8.51E-02 8.52E-02 8.47E-02 8.48E-02 8.48E-02 0 8.35E-02 8.39E-02 8.49E-02 8.52E-02 8.59E-02 8.23E-02 8.42E-02 8.38E-02 8.47E-02 8.46E-02 8.53E-02 8.50E-02 10 8.33E-02 8.36E-02 8.47E-02 8.50E-02 8.57E-02 8.22E-02 8.41E-02 8.36E-02 8.44E-02 8.43E-02 8.51E-02 8.47E-02 8.47E-02 9.86E-04 8.74E-02 8.20E-02 8.45E-02 1.00E-03 8.72E-02 8.17E-02 8.44E-02 9.63E-04 8.70E-02 8.17E-02 8.42E-02 1.02E-03 8.70E-02 8.15E-02 8.39E-02 9.78E-04 8.65E-02 8.12E-02 8.29E-02 8.33E-04 8.51E-02 8.06E-02 8.39E-02 9.57E-04 8.65E-02 8.13E-02 6.00E-02 PASS 8.37E-02 9.20E-04 8.62E-02 8.12E-02 6.00E-02 PASS 8.37E-02 8.71E-04 8.60E-02 8.13E-02 6.00E-02 PASS 8.35E-02 8.85E-04 8.59E-02 8.11E-02 6.00E-02 PASS 8.32E-02 8.56E-04 8.55E-02 8.09E-02 6.00E-02 PASS 8.27E-02 7.33E-04 8.47E-02 8.07E-02 6.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 72 200 8.17E-02 8.25E-02 8.31E-02 8.32E-02 8.39E-02 8.15E-02 8.29E-02 8.26E-02 8.32E-02 8.34E-02 8.51E-02 8.48E-02 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-03 VOS @ +/-2.5V VCM=V- 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.34. Plot of VOS @ +/-2.5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 73 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.34. Raw data for VOS @ +/-2.5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOS @ +/-2.5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 6.32E-04 -1.31E-04 2.65E-04 1.50E-05 5.86E-04 7.78E-04 3.89E-04 1.01E-03 -1.36E-04 -8.20E-05 2.82E-04 1.08E-03 10 6.23E-04 -1.23E-04 2.58E-04 1.50E-05 5.84E-04 7.63E-04 3.84E-04 1.01E-03 -1.48E-04 -8.50E-05 2.77E-04 1.07E-03 Total Dose (krad(Si)) 20 50 6.35E-04 6.47E-04 -1.26E-04 -1.06E-04 2.58E-04 2.65E-04 2.70E-05 3.90E-05 5.86E-04 5.98E-04 7.66E-04 7.66E-04 3.92E-04 3.99E-04 1.01E-03 1.02E-03 -1.43E-04 -1.26E-04 -8.20E-05 -8.20E-05 2.82E-04 2.80E-04 1.07E-03 1.07E-03 100 6.64E-04 -9.90E-05 2.70E-04 6.10E-05 5.98E-04 7.76E-04 4.16E-04 1.04E-03 -1.09E-04 -7.20E-05 2.75E-04 1.07E-03 200 6.83E-04 -7.00E-05 2.85E-04 8.80E-05 6.23E-04 7.68E-04 4.48E-04 1.05E-03 -8.20E-05 -6.30E-05 2.77E-04 1.07E-03 2.73E-04 3.38E-04 1.20E-03 -6.53E-04 2.71E-04 3.33E-04 1.18E-03 -6.41E-04 2.76E-04 3.35E-04 1.19E-03 -6.43E-04 2.89E-04 3.33E-04 1.20E-03 -6.24E-04 2.99E-04 3.31E-04 1.21E-03 -6.09E-04 3.22E-04 3.28E-04 1.22E-03 -5.78E-04 3.93E-04 5.10E-04 1.79E-03 -1.01E-03 -2.00E-03 PASS 2.00E-03 PASS 3.85E-04 5.10E-04 1.78E-03 -1.01E-03 -2.00E-03 PASS 2.00E-03 PASS 3.89E-04 5.09E-04 1.79E-03 -1.01E-03 -2.00E-03 PASS 2.00E-03 PASS 3.96E-04 5.08E-04 1.79E-03 -9.96E-04 -2.00E-03 PASS 2.00E-03 PASS 4.09E-04 5.07E-04 1.80E-03 -9.80E-04 -2.00E-03 PASS 2.00E-03 PASS 4.24E-04 5.00E-04 1.80E-03 -9.48E-04 -2.00E-03 PASS 2.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 74 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-06 IIO @ +/-2.5V VCM=V- 4.00E-06 2.00E-06 0.00E+00 -2.00E-06 -4.00E-06 -6.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.35. Plot of IIO @ +/-2.5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 75 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.35. Raw data for IIO @ +/-2.5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IIO @ +/-2.5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 4.25E-07 -1.24E-07 9.60E-08 -8.20E-08 3.27E-07 6.39E-07 2.39E-07 7.22E-07 -1.81E-07 -9.30E-08 1.37E-07 7.26E-07 10 4.20E-07 -1.27E-07 9.00E-08 -7.90E-08 3.28E-07 6.33E-07 2.37E-07 7.24E-07 -1.90E-07 -9.40E-08 1.40E-07 7.25E-07 Total Dose (krad(Si)) 20 50 4.24E-07 4.31E-07 -1.33E-07 -1.47E-07 9.00E-08 8.40E-08 -7.60E-08 -6.50E-08 3.34E-07 3.48E-07 6.31E-07 6.26E-07 2.38E-07 2.40E-07 7.22E-07 7.23E-07 -1.86E-07 -1.82E-07 -9.40E-08 -9.50E-08 1.40E-07 1.39E-07 7.25E-07 7.25E-07 100 4.36E-07 -1.73E-07 6.50E-08 -6.50E-08 3.67E-07 6.15E-07 2.41E-07 7.26E-07 -1.88E-07 -1.07E-07 1.39E-07 7.26E-07 200 4.30E-07 -2.31E-07 3.20E-08 -7.30E-08 4.00E-07 6.31E-07 2.25E-07 7.07E-07 -2.28E-07 -1.49E-07 1.39E-07 7.25E-07 1.28E-07 2.43E-07 7.95E-07 -5.38E-07 1.26E-07 2.42E-07 7.90E-07 -5.38E-07 1.28E-07 2.46E-07 8.01E-07 -5.46E-07 1.30E-07 2.52E-07 8.23E-07 -5.62E-07 1.26E-07 2.66E-07 8.56E-07 -6.04E-07 1.12E-07 2.93E-07 9.14E-07 -6.91E-07 2.65E-07 4.11E-07 1.39E-06 -8.62E-07 -5.00E-06 PASS 5.00E-06 PASS 2.62E-07 4.13E-07 1.39E-06 -8.71E-07 -5.00E-06 PASS 5.00E-06 PASS 2.62E-07 4.11E-07 1.39E-06 -8.65E-07 -5.00E-06 PASS 5.00E-06 PASS 2.62E-07 4.09E-07 1.38E-06 -8.60E-07 -5.00E-06 PASS 5.00E-06 PASS 2.57E-07 4.12E-07 1.39E-06 -8.72E-07 -5.00E-06 PASS 5.00E-06 PASS 2.37E-07 4.31E-07 1.42E-06 -9.43E-07 -5.00E-06 PASS 5.00E-06 PASS An ISO 9001:2008 and DSCC Certified Company 76 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-05 IB+ @ +/-2.5V VCM=V- 4.00E-05 2.00E-05 0.00E+00 -2.00E-05 -4.00E-05 -6.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.36. Plot of IB+ @ +/-2.5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 77 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.36. Raw data for IB+ @ +/-2.5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB+ @ +/-2.5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.27E-05 -2.27E-05 -2.21E-05 -2.24E-05 -2.24E-05 -2.28E-05 -2.17E-05 -2.23E-05 -2.25E-05 -2.25E-05 -2.23E-05 -2.19E-05 10 -2.26E-05 -2.26E-05 -2.20E-05 -2.23E-05 -2.23E-05 -2.29E-05 -2.18E-05 -2.23E-05 -2.25E-05 -2.25E-05 -2.23E-05 -2.19E-05 Total Dose (krad(Si)) 20 50 -2.27E-05 -2.28E-05 -2.27E-05 -2.29E-05 -2.21E-05 -2.23E-05 -2.24E-05 -2.25E-05 -2.23E-05 -2.24E-05 -2.29E-05 -2.30E-05 -2.18E-05 -2.19E-05 -2.23E-05 -2.25E-05 -2.26E-05 -2.27E-05 -2.26E-05 -2.27E-05 -2.23E-05 -2.23E-05 -2.19E-05 -2.19E-05 100 -2.30E-05 -2.32E-05 -2.24E-05 -2.27E-05 -2.25E-05 -2.32E-05 -2.20E-05 -2.26E-05 -2.28E-05 -2.29E-05 -2.23E-05 -2.19E-05 200 -2.32E-05 -2.37E-05 -2.26E-05 -2.30E-05 -2.24E-05 -2.34E-05 -2.24E-05 -2.30E-05 -2.32E-05 -2.32E-05 -2.23E-05 -2.19E-05 -2.25E-05 2.36E-07 -2.18E-05 -2.31E-05 -2.24E-05 2.50E-07 -2.17E-05 -2.30E-05 -2.24E-05 2.56E-07 -2.17E-05 -2.31E-05 -2.26E-05 2.67E-07 -2.19E-05 -2.33E-05 -2.28E-05 3.36E-07 -2.18E-05 -2.37E-05 -2.30E-05 5.15E-07 -2.16E-05 -2.44E-05 -2.24E-05 4.03E-07 -2.13E-05 -2.35E-05 -5.00E-05 PASS 5.00E-05 PASS -2.24E-05 4.00E-07 -2.13E-05 -2.35E-05 -5.00E-05 PASS 5.00E-05 PASS -2.24E-05 4.04E-07 -2.13E-05 -2.35E-05 -5.00E-05 PASS 5.00E-05 PASS -2.25E-05 4.03E-07 -2.14E-05 -2.37E-05 -5.00E-05 PASS 5.00E-05 PASS -2.27E-05 4.19E-07 -2.16E-05 -2.39E-05 -5.00E-05 PASS 5.00E-05 PASS -2.30E-05 3.97E-07 -2.20E-05 -2.41E-05 -5.00E-05 PASS 5.00E-05 PASS An ISO 9001:2008 and DSCC Certified Company 78 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-05 IB- @ +/-2.5V VCM=V- 4.00E-05 2.00E-05 0.00E+00 -2.00E-05 -4.00E-05 -6.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.37. Plot of IB- @ +/-2.5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 79 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.37. Raw data for IB- @ +/-2.5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB- @ +/-2.5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.30E-05 -2.25E-05 -2.22E-05 -2.22E-05 -2.26E-05 -2.34E-05 -2.19E-05 -2.29E-05 -2.22E-05 -2.23E-05 -2.23E-05 -2.26E-05 10 -2.29E-05 -2.24E-05 -2.20E-05 -2.21E-05 -2.25E-05 -2.34E-05 -2.19E-05 -2.30E-05 -2.22E-05 -2.23E-05 -2.23E-05 -2.25E-05 Total Dose (krad(Si)) 20 50 -2.30E-05 -2.31E-05 -2.25E-05 -2.27E-05 -2.21E-05 -2.23E-05 -2.22E-05 -2.24E-05 -2.26E-05 -2.27E-05 -2.34E-05 -2.36E-05 -2.20E-05 -2.21E-05 -2.30E-05 -2.31E-05 -2.23E-05 -2.24E-05 -2.24E-05 -2.25E-05 -2.23E-05 -2.23E-05 -2.25E-05 -2.25E-05 100 -2.33E-05 -2.29E-05 -2.24E-05 -2.25E-05 -2.28E-05 -2.37E-05 -2.22E-05 -2.33E-05 -2.25E-05 -2.26E-05 -2.23E-05 -2.25E-05 200 -2.35E-05 -2.34E-05 -2.25E-05 -2.28E-05 -2.27E-05 -2.40E-05 -2.25E-05 -2.36E-05 -2.28E-05 -2.30E-05 -2.23E-05 -2.25E-05 -2.25E-05 3.47E-07 -2.15E-05 -2.35E-05 -2.24E-05 3.53E-07 -2.14E-05 -2.34E-05 -2.25E-05 3.56E-07 -2.15E-05 -2.35E-05 -2.26E-05 3.45E-07 -2.17E-05 -2.36E-05 -2.28E-05 3.63E-07 -2.18E-05 -2.38E-05 -2.30E-05 4.36E-07 -2.18E-05 -2.42E-05 -2.25E-05 5.84E-07 -2.09E-05 -2.42E-05 -5.00E-05 PASS 5.00E-05 PASS -2.26E-05 5.93E-07 -2.09E-05 -2.42E-05 -5.00E-05 PASS 5.00E-05 PASS -2.26E-05 5.99E-07 -2.10E-05 -2.43E-05 -5.00E-05 PASS 5.00E-05 PASS -2.27E-05 5.99E-07 -2.11E-05 -2.44E-05 -5.00E-05 PASS 5.00E-05 PASS -2.29E-05 6.19E-07 -2.12E-05 -2.46E-05 -5.00E-05 PASS 5.00E-05 PASS -2.32E-05 6.20E-07 -2.15E-05 -2.49E-05 -5.00E-05 PASS 5.00E-05 PASS An ISO 9001:2008 and DSCC Certified Company 80 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.50E-03 VOS @ +/-2.5V VCM=V+ 2.00E-03 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 -2.00E-03 -2.50E-03 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.38. Plot of VOS @ +/-2.5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 81 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.38. Raw data for VOS @ +/-2.5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOS @ +/-2.5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -3.01E-04 -1.12E-03 -8.06E-04 -3.66E-04 -3.62E-04 4.77E-04 -3.74E-04 2.46E-04 -3.40E-05 -4.59E-04 -4.47E-04 3.31E-04 10 -3.01E-04 -1.10E-03 -8.09E-04 -3.62E-04 -3.66E-04 4.65E-04 -3.74E-04 2.46E-04 -3.80E-05 -4.59E-04 -4.39E-04 3.31E-04 Total Dose (krad(Si)) 20 50 -3.01E-04 -2.91E-04 -1.10E-03 -1.10E-03 -8.06E-04 -7.99E-04 -3.62E-04 -3.49E-04 -3.64E-04 -3.62E-04 4.64E-04 4.65E-04 -3.74E-04 -3.62E-04 2.46E-04 2.46E-04 -3.40E-05 -2.10E-05 -4.59E-04 -4.56E-04 -4.34E-04 -4.39E-04 3.31E-04 3.28E-04 100 -2.89E-04 -1.09E-03 -7.89E-04 -3.35E-04 -3.52E-04 4.65E-04 -3.49E-04 2.53E-04 -2.10E-05 -4.51E-04 -4.44E-04 3.31E-04 200 -2.64E-04 -1.07E-03 -7.75E-04 -3.03E-04 -3.37E-04 4.57E-04 -3.32E-04 2.70E-04 3.00E-06 -4.47E-04 -4.47E-04 3.31E-04 -5.90E-04 3.56E-04 3.87E-04 -1.57E-03 -5.88E-04 3.52E-04 3.78E-04 -1.55E-03 -5.87E-04 3.52E-04 3.79E-04 -1.55E-03 -5.79E-04 3.53E-04 3.88E-04 -1.55E-03 -5.71E-04 3.54E-04 3.99E-04 -1.54E-03 -5.49E-04 3.55E-04 4.25E-04 -1.52E-03 -2.88E-05 3.99E-04 1.06E-03 -1.12E-03 -2.00E-03 PASS 2.00E-03 PASS -3.20E-05 3.95E-04 1.05E-03 -1.11E-03 -2.00E-03 PASS 2.00E-03 PASS -3.14E-05 3.95E-04 1.05E-03 -1.11E-03 -2.00E-03 PASS 2.00E-03 PASS -2.56E-05 3.91E-04 1.05E-03 -1.10E-03 -2.00E-03 PASS 2.00E-03 PASS -2.06E-05 3.89E-04 1.04E-03 -1.09E-03 -2.00E-03 PASS 2.00E-03 PASS -9.80E-06 3.84E-04 1.04E-03 -1.06E-03 -2.00E-03 PASS 2.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 82 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 5.00E-06 4.00E-06 IIO @ +/-2.5V VCM=V+ 3.00E-06 2.00E-06 1.00E-06 0.00E+00 -1.00E-06 -2.00E-06 -3.00E-06 -4.00E-06 -5.00E-06 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.39. Plot of IIO @ +/-2.5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 83 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.39. Raw data for IIO @ +/-2.5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IIO @ +/-2.5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.35E-07 -4.51E-07 -3.37E-07 -1.22E-07 -1.25E-07 2.07E-07 -1.29E-07 9.00E-08 7.00E-09 -1.99E-07 -1.68E-07 1.27E-07 10 -1.53E-07 -4.66E-07 -3.39E-07 -1.22E-07 -1.23E-07 1.98E-07 -1.36E-07 8.20E-08 0.00E+00 -2.01E-07 -1.64E-07 1.30E-07 Total Dose (krad(Si)) 20 50 -1.68E-07 -2.01E-07 -4.79E-07 -5.14E-07 -3.39E-07 -3.33E-07 -1.23E-07 -1.16E-07 -1.22E-07 -1.13E-07 1.87E-07 1.61E-07 -1.46E-07 -1.71E-07 7.00E-08 4.10E-08 -1.00E-08 -4.20E-08 -2.04E-07 -2.19E-07 -1.64E-07 -1.65E-07 1.30E-07 1.29E-07 100 -2.42E-07 -5.52E-07 -3.25E-07 -1.16E-07 -1.03E-07 1.14E-07 -2.14E-07 -2.00E-09 -9.30E-08 -2.48E-07 -1.65E-07 1.30E-07 200 -3.02E-07 -6.05E-07 -3.11E-07 -1.07E-07 -7.30E-08 1.12E-07 -2.75E-07 -5.90E-08 -1.78E-07 -3.01E-07 -1.65E-07 1.30E-07 -2.34E-07 1.52E-07 1.82E-07 -6.50E-07 -2.41E-07 1.55E-07 1.84E-07 -6.66E-07 -2.46E-07 1.58E-07 1.86E-07 -6.79E-07 -2.55E-07 1.70E-07 2.11E-07 -7.21E-07 -2.68E-07 1.84E-07 2.36E-07 -7.71E-07 -2.80E-07 2.12E-07 3.02E-07 -8.61E-07 -4.80E-09 1.64E-07 4.44E-07 -4.54E-07 -4.00E-06 PASS 4.00E-06 PASS -1.14E-08 1.61E-07 4.31E-07 -4.54E-07 -4.00E-06 PASS 4.00E-06 PASS -2.06E-08 1.59E-07 4.15E-07 -4.56E-07 -4.00E-06 PASS 4.00E-06 PASS -4.60E-08 1.55E-07 3.79E-07 -4.71E-07 -4.00E-06 PASS 4.00E-06 PASS -8.86E-08 1.50E-07 3.22E-07 -4.99E-07 -4.00E-06 PASS 4.00E-06 PASS -1.40E-07 1.70E-07 3.26E-07 -6.06E-07 -4.00E-06 PASS 4.00E-06 PASS An ISO 9001:2008 and DSCC Certified Company 84 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-05 IB+ @ +/-2.5V VCM=V+ 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.40. Plot of IB+ @ +/-2.5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 85 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.40. Raw data for IB+ @ +/-2.5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB+ @ +/-2.5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 0 1.17E-05 1.14E-05 1.11E-05 1.15E-05 1.13E-05 1.18E-05 1.13E-05 1.17E-05 1.16E-05 1.13E-05 1.14E-05 1.13E-05 10 1.17E-05 1.15E-05 1.11E-05 1.15E-05 1.12E-05 1.19E-05 1.14E-05 1.18E-05 1.17E-05 1.13E-05 1.14E-05 1.13E-05 Biased Statistics Average Biased 1.14E-05 1.14E-05 Std Dev Biased 2.22E-07 2.50E-07 Ps90%/90% (+KTL) Biased 1.20E-05 1.21E-05 Ps90%/90% (-KTL) Biased 1.08E-05 1.07E-05 Un-Biased Statistics Average Un-Biased 1.15E-05 1.16E-05 Std Dev Un-Biased 2.21E-07 2.31E-07 Ps90%/90% (+KTL) Un-Biased 1.21E-05 1.22E-05 Ps90%/90% (-KTL) Un-Biased 1.09E-05 1.10E-05 Specification MIN -1.80E-05 -1.80E-05 Status PASS PASS Specification MAX 1.80E-05 1.80E-05 Status PASS PASS Total Dose (krad(Si)) 20 50 1.18E-05 1.21E-05 1.16E-05 1.18E-05 1.11E-05 1.13E-05 1.16E-05 1.18E-05 1.13E-05 1.15E-05 1.19E-05 1.22E-05 1.15E-05 1.17E-05 1.18E-05 1.21E-05 1.18E-05 1.20E-05 1.14E-05 1.16E-05 1.14E-05 1.14E-05 1.13E-05 1.13E-05 100 1.24E-05 1.22E-05 1.15E-05 1.20E-05 1.16E-05 1.27E-05 1.22E-05 1.26E-05 1.25E-05 1.19E-05 1.14E-05 1.13E-05 200 1.29E-05 1.27E-05 1.17E-05 1.25E-05 1.19E-05 1.27E-05 1.31E-05 1.35E-05 1.35E-05 1.27E-05 1.14E-05 1.13E-05 1.15E-05 2.63E-07 1.22E-05 1.08E-05 1.17E-05 3.07E-07 1.25E-05 1.08E-05 1.19E-05 3.79E-07 1.30E-05 1.09E-05 1.23E-05 5.38E-07 1.38E-05 1.09E-05 1.17E-05 2.38E-07 1.23E-05 1.10E-05 -1.80E-05 PASS 1.80E-05 PASS 1.19E-05 2.73E-07 1.27E-05 1.12E-05 -1.80E-05 PASS 1.80E-05 PASS 1.24E-05 3.33E-07 1.33E-05 1.15E-05 -1.80E-05 PASS 1.80E-05 PASS 1.31E-05 4.32E-07 1.43E-05 1.19E-05 -1.80E-05 PASS 1.80E-05 PASS An ISO 9001:2008 and DSCC Certified Company 86 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-05 IB- @ +/-2.5V VCM=V+ 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.41. Plot of IB- @ +/-2.5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 87 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.41. Raw data for IB- @ +/-2.5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB- @ +/-2.5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 0 1.19E-05 1.20E-05 1.15E-05 1.17E-05 1.15E-05 1.16E-05 1.15E-05 1.17E-05 1.17E-05 1.16E-05 1.16E-05 1.13E-05 10 1.20E-05 1.20E-05 1.15E-05 1.17E-05 1.14E-05 1.17E-05 1.16E-05 1.18E-05 1.18E-05 1.16E-05 1.17E-05 1.13E-05 Biased Statistics Average Biased 1.17E-05 1.17E-05 Std Dev Biased 2.18E-07 2.60E-07 Ps90%/90% (+KTL) Biased 1.23E-05 1.24E-05 Ps90%/90% (-KTL) Biased 1.11E-05 1.10E-05 Un-Biased Statistics Average Un-Biased 1.16E-05 1.17E-05 Std Dev Un-Biased 6.32E-08 7.18E-08 Ps90%/90% (+KTL) Un-Biased 1.18E-05 1.19E-05 Ps90%/90% (-KTL) Un-Biased 1.14E-05 1.15E-05 Specification MIN -1.80E-05 -1.80E-05 Status PASS PASS Specification MAX 1.80E-05 1.80E-05 Status PASS PASS Total Dose (krad(Si)) 20 50 1.21E-05 1.23E-05 1.21E-05 1.24E-05 1.16E-05 1.17E-05 1.18E-05 1.20E-05 1.15E-05 1.17E-05 1.18E-05 1.21E-05 1.17E-05 1.20E-05 1.18E-05 1.21E-05 1.18E-05 1.21E-05 1.17E-05 1.19E-05 1.17E-05 1.16E-05 1.13E-05 1.13E-05 100 1.27E-05 1.28E-05 1.19E-05 1.22E-05 1.18E-05 1.26E-05 1.25E-05 1.27E-05 1.27E-05 1.22E-05 1.16E-05 1.13E-05 200 1.33E-05 1.34E-05 1.21E-05 1.27E-05 1.21E-05 1.27E-05 1.35E-05 1.37E-05 1.38E-05 1.31E-05 1.17E-05 1.13E-05 1.18E-05 2.79E-07 1.26E-05 1.10E-05 1.20E-05 3.44E-07 1.30E-05 1.11E-05 1.23E-05 4.47E-07 1.35E-05 1.11E-05 1.27E-05 6.56E-07 1.45E-05 1.09E-05 1.18E-05 7.88E-08 1.20E-05 1.16E-05 -1.80E-05 PASS 1.80E-05 PASS 1.20E-05 1.16E-07 1.24E-05 1.17E-05 -1.80E-05 PASS 1.80E-05 PASS 1.25E-05 1.91E-07 1.31E-05 1.20E-05 -1.80E-05 PASS 1.80E-05 PASS 1.33E-05 4.71E-07 1.46E-05 1.20E-05 -1.80E-05 PASS 1.80E-05 PASS An ISO 9001:2008 and DSCC Certified Company 88 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-02 8.00E-03 VOS @ +/-5V VCM=V- 6.00E-03 4.00E-03 2.00E-03 0.00E+00 -2.00E-03 -4.00E-03 -6.00E-03 -8.00E-03 -1.00E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.42. Plot of VOS @ +/-5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 89 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.42. Raw data for VOS @ +/-5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOS @ +/-5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.98E-03 -2.72E-03 -2.37E-03 -2.72E-03 -2.03E-03 -1.99E-03 -2.22E-03 -1.73E-03 -2.90E-03 -2.87E-03 -2.37E-03 -1.77E-03 10 -1.96E-03 -2.68E-03 -2.36E-03 -2.70E-03 -2.02E-03 -1.99E-03 -2.21E-03 -1.73E-03 -2.87E-03 -2.84E-03 -2.34E-03 -1.73E-03 Total Dose (krad(Si)) 20 50 -1.97E-03 -1.96E-03 -2.68E-03 -2.68E-03 -2.37E-03 -2.36E-03 -2.71E-03 -2.69E-03 -2.03E-03 -2.01E-03 -2.00E-03 -2.00E-03 -2.21E-03 -2.20E-03 -1.74E-03 -1.73E-03 -2.87E-03 -2.86E-03 -2.85E-03 -2.84E-03 -2.33E-03 -2.34E-03 -1.73E-03 -1.75E-03 100 -1.99E-03 -2.69E-03 -2.39E-03 -2.72E-03 -2.04E-03 -2.01E-03 -2.20E-03 -1.73E-03 -2.85E-03 -2.84E-03 -2.35E-03 -1.74E-03 200 -2.02E-03 -2.69E-03 -2.46E-03 -2.79E-03 -2.12E-03 -2.03E-03 -2.20E-03 -1.73E-03 -2.85E-03 -2.84E-03 -2.34E-03 -1.74E-03 -2.36E-03 3.60E-04 -1.37E-03 -3.35E-03 -2.35E-03 3.52E-04 -1.38E-03 -3.31E-03 -2.35E-03 3.50E-04 -1.39E-03 -3.31E-03 -2.34E-03 3.52E-04 -1.37E-03 -3.31E-03 -2.37E-03 3.46E-04 -1.42E-03 -3.32E-03 -2.42E-03 3.42E-04 -1.48E-03 -3.36E-03 -2.34E-03 5.25E-04 -9.03E-04 -3.78E-03 -7.50E-03 PASS 7.50E-03 PASS -2.33E-03 5.10E-04 -9.31E-04 -3.73E-03 -7.50E-03 PASS 7.50E-03 PASS -2.33E-03 5.08E-04 -9.39E-04 -3.72E-03 -7.50E-03 PASS 7.50E-03 PASS -2.33E-03 5.06E-04 -9.41E-04 -3.71E-03 -7.50E-03 PASS 7.50E-03 PASS -2.33E-03 5.03E-04 -9.45E-04 -3.71E-03 -7.50E-03 PASS 7.50E-03 PASS -2.33E-03 5.00E-04 -9.57E-04 -3.70E-03 -7.50E-03 PASS 7.50E-03 PASS An ISO 9001:2008 and DSCC Certified Company 90 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-05 IIO @ +/-5V VCM=V- 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.43. Plot of IIO @ +/-5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 91 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.43. Raw data for IIO @ +/-5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IIO @ +/-5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.74E-06 -2.27E-06 -2.09E-06 -2.27E-06 -1.86E-06 -1.68E-06 -1.87E-06 -1.52E-06 -2.25E-06 -2.25E-06 -2.07E-06 -1.56E-06 10 -1.74E-06 -2.27E-06 -2.09E-06 -2.27E-06 -1.85E-06 -1.69E-06 -1.87E-06 -1.52E-06 -2.25E-06 -2.25E-06 -2.05E-06 -1.54E-06 Total Dose (krad(Si)) 20 50 -1.75E-06 -1.76E-06 -2.27E-06 -2.27E-06 -2.11E-06 -2.13E-06 -2.27E-06 -2.27E-06 -1.85E-06 -1.85E-06 -1.70E-06 -1.72E-06 -1.88E-06 -1.89E-06 -1.53E-06 -1.54E-06 -2.25E-06 -2.25E-06 -2.25E-06 -2.26E-06 -2.05E-06 -2.06E-06 -1.54E-06 -1.55E-06 100 -1.79E-06 -2.27E-06 -2.18E-06 -2.27E-06 -1.85E-06 -1.76E-06 -1.91E-06 -1.56E-06 -2.26E-06 -2.26E-06 -2.06E-06 -1.54E-06 200 -1.84E-06 -2.27E-06 -2.25E-06 -2.26E-06 -1.84E-06 -1.77E-06 -1.97E-06 -1.63E-06 -2.26E-06 -2.26E-06 -2.06E-06 -1.54E-06 -2.04E-06 2.39E-07 -1.39E-06 -2.70E-06 -2.04E-06 2.41E-07 -1.38E-06 -2.71E-06 -2.05E-06 2.39E-07 -1.39E-06 -2.70E-06 -2.06E-06 2.38E-07 -1.40E-06 -2.71E-06 -2.07E-06 2.32E-07 -1.43E-06 -2.71E-06 -2.09E-06 2.30E-07 -1.46E-06 -2.72E-06 -1.91E-06 3.31E-07 -1.01E-06 -2.82E-06 -1.50E-05 PASS 1.50E-05 PASS -1.92E-06 3.32E-07 -1.01E-06 -2.83E-06 -1.50E-05 PASS 1.50E-05 PASS -1.92E-06 3.27E-07 -1.03E-06 -2.82E-06 -1.50E-05 PASS 1.50E-05 PASS -1.93E-06 3.20E-07 -1.05E-06 -2.81E-06 -1.50E-05 PASS 1.50E-05 PASS -1.95E-06 3.07E-07 -1.10E-06 -2.79E-06 -1.50E-05 PASS 1.50E-05 PASS -1.98E-06 2.84E-07 -1.20E-06 -2.75E-06 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 92 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-05 IB+ @ +/-5V VCM=V- 4.00E-05 2.00E-05 0.00E+00 -2.00E-05 -4.00E-05 -6.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.44. Plot of IB+ @ +/-5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 93 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.44. Raw data for IB+ @ +/-5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB+ @ +/-5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.34E-05 -2.27E-05 -2.30E-05 -2.27E-05 -2.33E-05 -2.34E-05 -2.32E-05 -2.36E-05 -2.25E-05 -2.25E-05 -2.30E-05 -2.36E-05 10 -2.34E-05 -2.27E-05 -2.30E-05 -2.27E-05 -2.33E-05 -2.34E-05 -2.32E-05 -2.36E-05 -2.25E-05 -2.25E-05 -2.30E-05 -2.36E-05 Total Dose (krad(Si)) 20 50 -2.34E-05 -2.34E-05 -2.27E-05 -2.27E-05 -2.30E-05 -2.30E-05 -2.27E-05 -2.27E-05 -2.33E-05 -2.34E-05 -2.34E-05 -2.34E-05 -2.32E-05 -2.32E-05 -2.36E-05 -2.36E-05 -2.25E-05 -2.25E-05 -2.25E-05 -2.25E-05 -2.30E-05 -2.30E-05 -2.37E-05 -2.36E-05 100 -2.34E-05 -2.27E-05 -2.30E-05 -2.27E-05 -2.33E-05 -2.34E-05 -2.32E-05 -2.37E-05 -2.25E-05 -2.25E-05 -2.30E-05 -2.37E-05 200 -2.34E-05 -2.27E-05 -2.29E-05 -2.26E-05 -2.33E-05 -2.34E-05 -2.32E-05 -2.37E-05 -2.25E-05 -2.26E-05 -2.30E-05 -2.37E-05 -2.30E-05 3.59E-07 -2.20E-05 -2.40E-05 -2.30E-05 3.56E-07 -2.20E-05 -2.40E-05 -2.30E-05 3.51E-07 -2.21E-05 -2.40E-05 -2.30E-05 3.54E-07 -2.21E-05 -2.40E-05 -2.30E-05 3.49E-07 -2.21E-05 -2.40E-05 -2.30E-05 3.43E-07 -2.20E-05 -2.39E-05 -2.30E-05 5.20E-07 -2.16E-05 -2.45E-05 -5.00E-05 PASS 5.00E-05 PASS -2.30E-05 5.08E-07 -2.17E-05 -2.44E-05 -5.00E-05 PASS 5.00E-05 PASS -2.30E-05 5.05E-07 -2.17E-05 -2.44E-05 -5.00E-05 PASS 5.00E-05 PASS -2.31E-05 5.04E-07 -2.17E-05 -2.44E-05 -5.00E-05 PASS 5.00E-05 PASS -2.31E-05 5.02E-07 -2.17E-05 -2.44E-05 -5.00E-05 PASS 5.00E-05 PASS -2.31E-05 4.97E-07 -2.17E-05 -2.44E-05 -5.00E-05 PASS 5.00E-05 PASS An ISO 9001:2008 and DSCC Certified Company 94 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 6.00E-05 IB- @ +/-5V VCM=V- 4.00E-05 2.00E-05 0.00E+00 -2.00E-05 -4.00E-05 -6.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.45. Plot of IB- @ +/-5V VCM=V- versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 95 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.45. Raw data for IB- @ +/-5V VCM=V- versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB- @ +/-5V VCM=VDevice 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.48E-05 -2.43E-05 -2.38E-05 -2.38E-05 -2.44E-05 -2.51E-05 -2.35E-05 -2.47E-05 -2.38E-05 -2.41E-05 -2.41E-05 -2.43E-05 10 -2.48E-05 -2.43E-05 -2.37E-05 -2.38E-05 -2.44E-05 -2.51E-05 -2.35E-05 -2.47E-05 -2.38E-05 -2.41E-05 -2.41E-05 -2.42E-05 Total Dose (krad(Si)) 20 50 -2.49E-05 -2.51E-05 -2.43E-05 -2.46E-05 -2.37E-05 -2.41E-05 -2.38E-05 -2.43E-05 -2.44E-05 -2.47E-05 -2.52E-05 -2.53E-05 -2.36E-05 -2.37E-05 -2.48E-05 -2.49E-05 -2.41E-05 -2.42E-05 -2.41E-05 -2.43E-05 -2.41E-05 -2.41E-05 -2.42E-05 -2.42E-05 100 -2.51E-05 -2.49E-05 -2.41E-05 -2.43E-05 -2.46E-05 -2.56E-05 -2.41E-05 -2.51E-05 -2.44E-05 -2.45E-05 -2.41E-05 -2.42E-05 200 -2.49E-05 -2.51E-05 -2.36E-05 -2.37E-05 -2.37E-05 -2.58E-05 -2.43E-05 -2.55E-05 -2.46E-05 -2.48E-05 -2.41E-05 -2.42E-05 -2.42E-05 4.52E-07 -2.30E-05 -2.54E-05 -2.42E-05 4.52E-07 -2.30E-05 -2.54E-05 -2.42E-05 4.70E-07 -2.30E-05 -2.55E-05 -2.45E-05 3.95E-07 -2.35E-05 -2.56E-05 -2.46E-05 4.11E-07 -2.35E-05 -2.57E-05 -2.42E-05 7.11E-07 -2.22E-05 -2.61E-05 -2.42E-05 6.36E-07 -2.25E-05 -2.60E-05 -5.00E-05 PASS 5.00E-05 PASS -2.43E-05 6.48E-07 -2.25E-05 -2.60E-05 -5.00E-05 PASS 5.00E-05 PASS -2.43E-05 6.32E-07 -2.26E-05 -2.61E-05 -5.00E-05 PASS 5.00E-05 PASS -2.45E-05 6.31E-07 -2.28E-05 -2.62E-05 -5.00E-05 PASS 5.00E-05 PASS -2.47E-05 6.11E-07 -2.30E-05 -2.64E-05 -5.00E-05 PASS 5.00E-05 PASS -2.50E-05 6.50E-07 -2.32E-05 -2.68E-05 -5.00E-05 PASS 5.00E-05 PASS An ISO 9001:2008 and DSCC Certified Company 96 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-02 8.00E-03 VOS @ +/-5V VCM=V+ 6.00E-03 4.00E-03 2.00E-03 0.00E+00 -2.00E-03 -4.00E-03 -6.00E-03 -8.00E-03 -1.00E-02 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.46. Plot of VOS @ +/-5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 97 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.46. Raw data for VOS @ +/-5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). VOS @ +/-5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -2.61E-03 -3.42E-03 -3.20E-03 -2.91E-03 -2.76E-03 -2.01E-03 -2.74E-03 -2.28E-03 -2.55E-03 -3.02E-03 -2.80E-03 -2.28E-03 10 -2.59E-03 -3.39E-03 -3.19E-03 -2.89E-03 -2.75E-03 -2.01E-03 -2.73E-03 -2.27E-03 -2.52E-03 -2.99E-03 -2.77E-03 -2.24E-03 Total Dose (krad(Si)) 20 50 -2.60E-03 -2.60E-03 -3.39E-03 -3.40E-03 -3.20E-03 -3.19E-03 -2.90E-03 -2.88E-03 -2.76E-03 -2.74E-03 -2.03E-03 -2.03E-03 -2.73E-03 -2.74E-03 -2.29E-03 -2.28E-03 -2.53E-03 -2.53E-03 -3.00E-03 -3.00E-03 -2.77E-03 -2.77E-03 -2.24E-03 -2.26E-03 100 -2.65E-03 -3.41E-03 -3.22E-03 -2.93E-03 -2.77E-03 -2.05E-03 -2.74E-03 -2.29E-03 -2.53E-03 -3.00E-03 -2.78E-03 -2.25E-03 200 -2.67E-03 -3.42E-03 -3.29E-03 -3.00E-03 -2.86E-03 -2.06E-03 -2.77E-03 -2.31E-03 -2.55E-03 -3.01E-03 -2.78E-03 -2.25E-03 -2.98E-03 3.31E-04 -2.07E-03 -3.89E-03 -2.96E-03 3.25E-04 -2.07E-03 -3.85E-03 -2.97E-03 3.22E-04 -2.08E-03 -3.85E-03 -2.96E-03 3.27E-04 -2.06E-03 -3.86E-03 -3.00E-03 3.16E-04 -2.13E-03 -3.86E-03 -3.05E-03 3.09E-04 -2.20E-03 -3.89E-03 -2.52E-03 3.92E-04 -1.45E-03 -3.60E-03 -7.50E-03 PASS 7.50E-03 PASS -2.51E-03 3.82E-04 -1.46E-03 -3.55E-03 -7.50E-03 PASS 7.50E-03 PASS -2.51E-03 3.78E-04 -1.48E-03 -3.55E-03 -7.50E-03 PASS 7.50E-03 PASS -2.51E-03 3.78E-04 -1.48E-03 -3.55E-03 -7.50E-03 PASS 7.50E-03 PASS -2.52E-03 3.71E-04 -1.50E-03 -3.54E-03 -7.50E-03 PASS 7.50E-03 PASS -2.54E-03 3.72E-04 -1.52E-03 -3.56E-03 -7.50E-03 PASS 7.50E-03 PASS An ISO 9001:2008 and DSCC Certified Company 98 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-05 IIO @ +/-5V VCM=V+ 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.47. Plot of IIO @ +/-5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 99 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.47. Raw data for IIO @ +/-5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IIO @ +/-5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 0 -1.23E-06 -1.57E-06 -1.46E-06 -1.31E-06 -1.23E-06 -9.35E-07 -1.23E-06 -1.08E-06 -1.16E-06 -1.39E-06 -1.27E-06 -1.03E-06 10 -1.26E-06 -1.59E-06 -1.47E-06 -1.31E-06 -1.23E-06 -9.52E-07 -1.25E-06 -1.09E-06 -1.17E-06 -1.39E-06 -1.27E-06 -1.02E-06 Total Dose (krad(Si)) 20 50 -1.29E-06 -1.35E-06 -1.62E-06 -1.68E-06 -1.47E-06 -1.48E-06 -1.32E-06 -1.34E-06 -1.23E-06 -1.24E-06 -9.72E-07 -1.03E-06 -1.26E-06 -1.32E-06 -1.12E-06 -1.17E-06 -1.19E-06 -1.25E-06 -1.40E-06 -1.43E-06 -1.27E-06 -1.27E-06 -1.02E-06 -1.03E-06 100 -1.43E-06 -1.76E-06 -1.49E-06 -1.37E-06 -1.25E-06 -1.12E-06 -1.40E-06 -1.27E-06 -1.35E-06 -1.50E-06 -1.27E-06 -1.03E-06 200 -1.55E-06 -1.87E-06 -1.50E-06 -1.42E-06 -1.25E-06 -1.13E-06 -1.55E-06 -1.41E-06 -1.53E-06 -1.62E-06 -1.27E-06 -1.03E-06 -1.36E-06 1.51E-07 -9.45E-07 -1.77E-06 -1.37E-06 1.55E-07 -9.47E-07 -1.80E-06 -1.39E-06 1.58E-07 -9.53E-07 -1.82E-06 -1.41E-06 1.72E-07 -9.44E-07 -1.89E-06 -1.46E-06 1.90E-07 -9.38E-07 -1.98E-06 -1.52E-06 2.26E-07 -8.97E-07 -2.14E-06 -1.16E-06 1.68E-07 -6.96E-07 -1.62E-06 -1.00E-05 PASS 1.00E-05 PASS -1.17E-06 1.64E-07 -7.21E-07 -1.62E-06 -1.00E-05 PASS 1.00E-05 PASS -1.19E-06 1.60E-07 -7.49E-07 -1.63E-06 -1.00E-05 PASS 1.00E-05 PASS -1.24E-06 1.52E-07 -8.22E-07 -1.66E-06 -1.00E-05 PASS 1.00E-05 PASS -1.33E-06 1.42E-07 -9.39E-07 -1.72E-06 -1.00E-05 PASS 1.00E-05 PASS -1.45E-06 1.94E-07 -9.15E-07 -1.98E-06 -1.00E-05 PASS 1.00E-05 PASS An ISO 9001:2008 and DSCC Certified Company 100 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-05 IB+ @ +/-5V VCM=V+ 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.48. Plot of IB+ @ +/-5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 101 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.48. Raw data for IB+ @ +/-5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB+ @ +/-5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 0 1.27E-05 1.25E-05 1.21E-05 1.25E-05 1.22E-05 1.28E-05 1.23E-05 1.27E-05 1.26E-05 1.23E-05 1.25E-05 1.23E-05 10 1.28E-05 1.26E-05 1.21E-05 1.25E-05 1.23E-05 1.29E-05 1.24E-05 1.28E-05 1.27E-05 1.23E-05 1.25E-05 1.23E-05 Biased Statistics Average Biased 1.24E-05 1.25E-05 Std Dev Biased 2.47E-07 2.76E-07 Ps90%/90% (+KTL) Biased 1.31E-05 1.32E-05 Ps90%/90% (-KTL) Biased 1.17E-05 1.17E-05 Un-Biased Statistics Average Un-Biased 1.25E-05 1.26E-05 Std Dev Un-Biased 2.22E-07 2.31E-07 Ps90%/90% (+KTL) Un-Biased 1.31E-05 1.33E-05 Ps90%/90% (-KTL) Un-Biased 1.19E-05 1.20E-05 Specification MIN -1.80E-05 -1.80E-05 Status PASS PASS Specification MAX 1.80E-05 1.80E-05 Status PASS PASS Total Dose (krad(Si)) 20 50 1.29E-05 1.32E-05 1.27E-05 1.29E-05 1.21E-05 1.23E-05 1.26E-05 1.29E-05 1.23E-05 1.25E-05 1.29E-05 1.33E-05 1.25E-05 1.28E-05 1.29E-05 1.31E-05 1.28E-05 1.31E-05 1.24E-05 1.26E-05 1.25E-05 1.25E-05 1.23E-05 1.23E-05 100 1.35E-05 1.33E-05 1.25E-05 1.30E-05 1.27E-05 1.38E-05 1.33E-05 1.37E-05 1.36E-05 1.30E-05 1.25E-05 1.23E-05 200 1.38E-05 1.38E-05 1.24E-05 1.32E-05 1.26E-05 1.38E-05 1.42E-05 1.47E-05 1.46E-05 1.38E-05 1.25E-05 1.23E-05 1.25E-05 3.01E-07 1.34E-05 1.17E-05 1.28E-05 3.42E-07 1.37E-05 1.18E-05 1.30E-05 4.11E-07 1.41E-05 1.19E-05 1.32E-05 6.56E-07 1.50E-05 1.14E-05 1.27E-05 2.40E-07 1.33E-05 1.20E-05 -1.80E-05 PASS 1.80E-05 PASS 1.30E-05 2.77E-07 1.37E-05 1.22E-05 -1.80E-05 PASS 1.80E-05 PASS 1.35E-05 3.48E-07 1.44E-05 1.25E-05 -1.80E-05 PASS 1.80E-05 PASS 1.42E-05 4.42E-07 1.54E-05 1.30E-05 -1.80E-05 PASS 1.80E-05 PASS An ISO 9001:2008 and DSCC Certified Company 102 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 2.00E-05 IB- @ +/-5V VCM=V+ 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 200 Total Dose (krad(Si)) Figure 5.49. Plot of IB- @ +/-5V VCM=V+ versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 103 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table 5.49. Raw data for IB- @ +/-5V VCM=V+ versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). IB- @ +/-5V VCM=V+ Device 1 2 3 4 5 6 7 8 9 10 11 12 0 1.40E-05 1.40E-05 1.35E-05 1.37E-05 1.35E-05 1.37E-05 1.35E-05 1.38E-05 1.38E-05 1.36E-05 1.37E-05 1.33E-05 10 1.41E-05 1.41E-05 1.36E-05 1.38E-05 1.35E-05 1.38E-05 1.36E-05 1.39E-05 1.39E-05 1.37E-05 1.38E-05 1.33E-05 Biased Statistics Average Biased 1.37E-05 1.38E-05 Std Dev Biased 2.48E-07 2.93E-07 Ps90%/90% (+KTL) Biased 1.44E-05 1.46E-05 Ps90%/90% (-KTL) Biased 1.31E-05 1.30E-05 Un-Biased Statistics Average Un-Biased 1.37E-05 1.38E-05 Std Dev Un-Biased 8.96E-08 9.88E-08 Ps90%/90% (+KTL) Un-Biased 1.39E-05 1.40E-05 Ps90%/90% (-KTL) Un-Biased 1.34E-05 1.35E-05 Specification MIN -1.80E-05 -1.80E-05 Status PASS PASS Specification MAX 1.80E-05 1.80E-05 Status PASS PASS Total Dose (krad(Si)) 20 50 1.42E-05 1.45E-05 1.43E-05 1.46E-05 1.36E-05 1.38E-05 1.39E-05 1.42E-05 1.36E-05 1.38E-05 1.39E-05 1.43E-05 1.37E-05 1.41E-05 1.39E-05 1.43E-05 1.40E-05 1.43E-05 1.38E-05 1.40E-05 1.38E-05 1.38E-05 1.33E-05 1.33E-05 100 1.49E-05 1.50E-05 1.39E-05 1.44E-05 1.39E-05 1.49E-05 1.47E-05 1.49E-05 1.49E-05 1.44E-05 1.38E-05 1.33E-05 200 1.54E-05 1.57E-05 1.39E-05 1.46E-05 1.38E-05 1.49E-05 1.57E-05 1.61E-05 1.61E-05 1.54E-05 1.38E-05 1.33E-05 1.39E-05 3.26E-07 1.48E-05 1.30E-05 1.42E-05 3.93E-07 1.53E-05 1.31E-05 1.44E-05 5.16E-07 1.58E-05 1.30E-05 1.47E-05 8.25E-07 1.69E-05 1.24E-05 1.39E-05 1.03E-07 1.41E-05 1.36E-05 -1.80E-05 PASS 1.80E-05 PASS 1.42E-05 1.41E-07 1.46E-05 1.38E-05 -1.80E-05 PASS 1.80E-05 PASS 1.48E-05 2.25E-07 1.54E-05 1.42E-05 -1.80E-05 PASS 1.80E-05 PASS 1.56E-05 5.15E-07 1.70E-05 1.42E-05 -1.80E-05 PASS 1.80E-05 PASS An ISO 9001:2008 and DSCC Certified Company 104 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices' Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as "read and record" and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the total ionizing dose test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Based on this criterion the RH6200 Low Noise Rail-to-Rail Input and Output Op Amp (from the lot date code identified on the first page of this test report) PASSED the total ionizing dose test to the maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications. An ISO 9001:2008 and DSCC Certified Company 105 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of a Sample Unit-Under-Test. Note that units are unmarked. An ISO 9001:2008 and DSCC Certified Company 106 RLAT Report 10-447 101221 R1.0 Appendix B: Radiation Bias Connections TID Radiation Biased Conditions: Pin Function Connection / Bias 1 SHDN NC 2 NC NC 3 -IN To Pin 7 via 10kΩ 4 +IN To 0V via 10kΩ Resistor 5 V- To -5V using 0.1µF Decoupling 6 NC NC 7 OUT To Pin 3 via 10kΩ 8 V+ To +5V using 0.1µF Decoupling 9 NC NC 10 NC NC TID Radiation Unbiased Conditions: All pins are connected to GND. Pin Function Connection / Bias 1 SHDN GND 2 NC GND 3 -IN GND 4 +IN GND 5 V- GND 6 NC GND 7 OUT GND 8 V+ GND 9 NC GND 10 NC GND An ISO 9001:2008 and DSCC Certified Company 107 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. Fig B.2. W package drawing (for reference only). An ISO 9001:2008 and DSCC Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions The expected ranges of values as well as the measurement conditions are taken from Linear Technology LT6200 Datasheet. All electrical tests for this device are performed on one of Radiation Assured Device's LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The measured parameters and test conditions are shown in Table C.1. A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020 for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DSCC Certified Company 109 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table C.1. Measured parameters, test conditions, and acceptance criteria for the RH6200 Low Noise Rail-to-Rail Input and Output Op Amp. Parameter Test Conditions + SUPPLY CURRENT @ +/-2.5V +/-2.5V - SUPPLY CURRENT @ +/-2.5V +/-2.5V + S/D SUPPLY CURRENT @ +/-2.5V +/-2.5V, VSHDN=0.3V S/D PIN CURRENT @ +/-2.5V +/-2.5V, VSHDN=0.3V CMRR @ +/-2.5V VCM=+/-1V +/-2.5V VCM=+/-1V CMRR @ +/-2.5V VCM=+/-2.5V +/-2.5V VCM=+/-2.5V AVOL @ +/-2.5V RL=1K VO=+/-2V +/-2.5V RL=1K VO=+/-2V AVOL @ +/-2.5V RL=100 VO=+/-1.5V +/-2.5V RL=100 VO=+/-1.5V VOH @ +/-2.5V IL=0 +/-2.5V IL=0 VOH @ +/-2.5V IL=5MA +/-2.5V IL=5MA VOH @ +/-2.5V IL=20MA +/-2.5V IL=20MA VOL @ +/-2.5V IL=0 +/-2.5V IL=0 VOL @ +/-2.5V IL=5MA +/-2.5V IL=5MA VOL @ +/-2.5V IL=20MA +/-2.5V IL=20MA ISC SOURCE @ +/-2.5V +/-2.5V ISC SINK @ +/-2.5V +/-2.5V + SUPPLY CURRENT @ +/-5V +/-5V - SUPPLY CURRENT @ +/-5V +/-5V + S/D SUPPLY CURRENT @ +/-5V +/-5V, VSHDN=0.3V S/D PIN CURRENT @ +/-5V +/-5V, VSHDN=0.3V CMRR @ +/-5V VCM=+/-2V +/-5V VCM=+/-2V CMRR @ +/-5V VCM=+/-5V +/-5V VCM=+/-5V PSRR @ +/-1.25V TO +/-5V +/-1.25V TO +/-5V An ISO 9001:2008 and DSCC Certified Company 110 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 AVOL @ +/-5V RL=1K VO=+/-4.5V +/-5V RL=1K VO=+/-4.5V AVOL @ +/-5V RL=100 VO=+/-2V +/-5V RL=100 VO=+/-2V VOH @ +/-5V IL=0 +/-5V IL=0 VOH @ +/-5V IL=5MA +/-5V IL=5MA VOH @ +/-5V IL=20MA +/-5V IL=20MA VOL @ +/-5V IL=0 +/-5V IL=0 VOL @ +/-5V IL=5MA +/-5V IL=5MA VOL @ +/-5V IL=20MA +/-5V IL=20MA ISC SOURCE @ +/-5V +/-5V ISC SINK @ +/-5V +/-5V VOS @ +/-2.5V VCM=V- +/-2.5V VCM=V- IIO @ +/-2.5V VCM=V- +/-2.5V VCM=V- IB+ @ +/-2.5V VCM=V- +/-2.5V VCM=V- IB- @ +/-2.5V VCM=V- +/-2.5V VCM=V- VOS @ +/-2.5V VCM=V+ +/-2.5V VCM=V+ IIO @ +/-2.5V VCM=V+ +/-2.5V VCM=V+ IB+ @ +/-2.5V VCM=V+ +/-2.5V VCM=V+ IB- @ +/-2.5V VCM=V+ +/-2.5V VCM=V+ VOS @ +/-5V VCM=V- +/-5V VCM=V- IIO @ +/-5V VCM=V- +/-5V VCM=V- IB+ @ +/-5V VCM=V- +/-5V VCM=V- IB- @ +/-5V VCM=V- +/-5V VCM=V- VOS @ +/-5V VCM=V+ +/-5V VCM=V+ IIO @ +/-5V VCM=V+ +/-5V VCM=V+ IB+ @ +/-5V VCM=V+ +/-5V VCM=V+ IB- @ +/-5V VCM=V+ +/-5V VCM=V+ An ISO 9001:2008 and DSCC Certified Company 111 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-447 101221 R1.0 Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH6200 Low Noise Rail-to-Rail Input and Output Op Amp. Pre-Irradiation Specification Parameter Measurement Precision/Resolution MIN MAX + SUPPLY CURRENT @ +/-2.5V - SUPPLY CURRENT @ +/-2.5V 2.00E-02 -2.00E-02 + S/D SUPPLY CURRENT @ +/-2.5V ±6.23E-04 ±6.15E-04 1.80E-03 ±1.07E-05 S/D PIN CURRENT @ +/-2.5V -2.80E-04 ±1.28E-06 CMRR @ +/-2.5V VCM=+/-1V 8.50E+01 ±7.28E-01 CMRR @ +/-2.5V VCM=+/-2.5V 6.50E+01 ±2.98E-01 AVOL @ +/-2.5V RL=1K VO=+/-2V 7.00E+01 ±2.46E+00 AVOL @ +/-2.5V RL=100 VO=+/-1.5V 1.10E+01 ±2.58E-01 VOH @ +/-2.5V IL=0 -1.10E-01 ±2.20E-03 VOH @ +/-2.5V IL=5MA -1.90E-01 ±2.85E-03 VOH @ +/-2.5V IL=20MA -4.00E-01 ±3.94E-03 VOL @ +/-2.5V IL=0 5.00E-02 ±3.75E-04 VOL @ +/-2.5V IL=5MA 1.00E-01 ±7.37E-04 VOL @ +/-2.5V IL=20MA 2.90E-01 ±1.87E-03 ISC SOURCE @ +/-2.5V -6.00E-02 ±6.98E-04 ISC SINK @ +/-2.5V 6.00E-02 ±4.69E-04 + SUPPLY CURRENT @ +/-5V - SUPPLY CURRENT @ +/-5V 2.90E-02 -2.90E-02 + S/D SUPPLY CURRENT @ +/-5V ±4.61E-04 ±4.60E-04 2.10E-03 ±4.47E-06 S/D PIN CURRENT @ +/-5V -2.95E-04 ±8.15E-07 CMRR @ +/-5V VCM=+/-2V 7.50E+01 ±4.79E-01 CMRR @ +/-5V VCM=+/-5V 6.50E+01 ±4.53E-02 PSRR @ +/-1.25V TO +/-5V 6.00E+01 ±1.39E-01 An ISO 9001:2008 and DSCC Certified Company 112 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 AVOL @ +/-5V RL=1K VO=+/-4.5V 4.60E+01 ±1.38E+01 AVOL @ +/-5V RL=100 VO=+/-2V 7.50E+00 ±1.70E-01 VOH @ +/-5V IL=0 -1.50E-01 ±1.60E-03 VOH @ +/-5V IL=5MA -2.30E-01 ±1.95E-03 VOH @ +/-5V IL=20MA -4.80E-01 ±2.77E-03 VOL @ +/-5V IL=0 7.00E-02 ±4.61E-04 VOL @ +/-5V IL=5MA 1.20E-01 ±5.25E-04 VOL @ +/-5V IL=20MA 3.10E-01 ±1.17E-03 ISC SOURCE @ +/-5V -6.00E-02 ±5.05E-04 ISC SINK @ +/-5V 6.00E-02 ±2.61E-04 VOS @ +/-2.5V VCM=V- -2.00E-03 2.00E-03 ±8.77E-06 IIO @ +/-2.5V VCM=V- -5.00E-06 5.00E-06 ±1.52E-09 IB+ @ +/-2.5V VCM=V- -5.00E-05 5.00E-05 ±5.75E-08 IB- @ +/-2.5V VCM=V- -5.00E-05 5.00E-05 ±5.96E-08 VOS @ +/-2.5V VCM=V+ -2.00E-03 2.00E-03 ±9.88E-06 IIO @ +/-2.5V VCM=V+ -4.00E-06 4.00E-06 ±2.99E-09 IB+ @ +/-2.5V VCM=V+ -1.80E-05 1.80E-05 ±2.79E-08 IB- @ +/-2.5V VCM=V+ -1.80E-05 1.80E-05 ±3.24E-08 VOS @ +/-5V VCM=V- -7.50E-03 7.50E-03 ±4.05E-05 IIO @ +/-5V VCM=V- -1.50E-05 1.50E-05 ±1.78E-08 IB+ @ +/-5V VCM=V- -5.00E-05 5.00E-05 ±4.34E-08 IB- @ +/-5V VCM=V- -5.00E-05 5.00E-05 ±5.93E-08 VOS @ +/-5V VCM=V+ -7.50E-03 7.50E-03 ±4.24E-05 IIO @ +/-5V VCM=V+ -1.00E-05 1.00E-05 ±5.19E-09 IB+ @ +/-5V VCM=V+ -1.80E-05 1.80E-05 ±2.25E-08 IB- @ +/-5V VCM=V+ -1.80E-05 1.80E-05 ±2.02E-08 An ISO 9001:2008 and DSCC Certified Company 113 RLAT Report 10-447 101221 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix D: List of Figures Used in the Results Section (Section 5) 5.1. 5.2. 5.3. 5.4. 5.5. 5.6. 5.7. 5.8. 5.9. 5.10. 5.11. 5.12. 5.13. 5.14. 5.15. 5.16. 5.17. 5.18. 5.19. 5.20. 5.21. 5.22. 5.23. 5.24. 5.25. 5.26. 5.27. 5.28. 5.29. 5.30. 5.31. 5.32. 5.33. 5.34. 5.35. 5.36. 5.37. 5.38. 5.39. 5.40. + SUPPLY CURRENT @ +/-2.5V - SUPPLY CURRENT @ +/-2.5V + S/D SUPPLY CURRENT @ +/-2.5V S/D PIN CURRENT @ +/-2.5V CMRR @ +/-2.5V VCM=+/-1V CMRR @ +/-2.5V VCM=+/-2.5V AVOL @ +/-2.5V RL=1K VO=+/-2V AVOL @ +/-2.5V RL=100 VO=+/-1.5V VOH @ +/-2.5V IL=0 VOH @ +/-2.5V IL=5MA VOH @ +/-2.5V IL=20MA VOL @ +/-2.5V IL=0 VOL @ +/-2.5V IL=5MA VOL @ +/-2.5V IL=20MA ISC SOURCE @ +/-2.5V ISC SINK @ +/-2.5V + SUPPLY CURRENT @ +/-5V - SUPPLY CURRENT @ +/-5V + S/D SUPPLY CURRENT @ +/-5V S/D PIN CURRENT @ +/-5V CMRR @ +/-5V VCM=+/-2V CMRR @ +/-5V VCM=+/-5V PSRR @ +/-1.25V TO +/-5V AVOL @ +/-5V RL=1K VO=+/-4.5V AVOL @ +/-5V RL=100 VO=+/-2V VOH @ +/-5V IL=0 VOH @ +/-5V IL=5MA VOH @ +/-5V IL=20MA VOL @ +/-5V IL=0 VOL @ +/-5V IL=5MA VOL @ +/-5V IL=20MA ISC SOURCE @ +/-5V ISC SINK @ +/-5V VOS @ +/-2.5V VCM=VIIO @ +/-2.5V VCM=VIB+ @ +/-2.5V VCM=VIB- @ +/-2.5V VCM=VVOS @ +/-2.5V VCM=V+ IIO @ +/-2.5V VCM=V+ IB+ @ +/-2.5V VCM=V+ An ISO 9001:2008 and DSCC Certified Company 114 RLAT Report 10-447 101221 R1.0 5.41. 5.42. 5.43. 5.44. 5.45. 5.46. 5.47. 5.48. 5.49. IB- @ +/-2.5V VCM=V+ VOS @ +/-5V VCM=VIIO @ +/-5V VCM=VIB+ @ +/-5V VCM=VIB- @ +/-5V VCM=VVOS @ +/-5V VCM=V+ IIO @ +/-5V VCM=V+ IB+ @ +/-5V VCM=V+ IB- @ +/-5V VCM=V+ An ISO 9001:2008 and DSCC Certified Company 115 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800