DDD_RH3080MK_Fab_Lot_H0923840_4_W3.pdf

DDD RH3080MK H0923840 W3
Neutron Irradiation Test Results of the RH3080MK
Adjustable 0.9A Single Resistor Low Dropout
Regulator
09 October 2014
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the S-Power Design and Product Engineering Groups
from Linear Technology for the data collection pre- and post-irradiations. Special thanks
are also for Thomas Regan from University of Massachusetts, Lowell (UMASS) for the
help with the neutrons irradiation tests.
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DDD RH3080MK H0923840 W3
Neutron Radiation Testing of the RH3080MK
Adjustable 0.9A Single Resistor Low Dropout
Regulator
Part Type Tested: RH3080MK Adjustable 0.9A Single Resistor Low Dropout Regulator, SPEC
NO. 05-08-5246 REV. 0
Traceability Information: Fab Lot# H0923840.4; Wafer # 3; Assembly Lot # 589490.2. See
photograph of unit under test in Appendix A.
Quantity of Units: 7 units received, 2 units for control, and 5 units for unbiased irradiation.
Leads of devices, serial numbers 1 to 5, were shorted together using anti-static foam during
irradiation. Serial numbers 11 and 12 were used as control. See Appendix B for the radiation
bias connection tables.
Radiation Dose: Total fluence of 1E12 neutron/cm2.
Radiation Test Standard: MIL-STD-883 TM1017 and Linear Technology RH3080MH SPEC
NO. 05-08-5246 REV. C and RH3080MK DICE/DWF
Test Hardware and Software: LTX test program EFCR3080R.00.
Facility and Radiation Source: University of Massachusetts, Lowell and Reactor Facility-FNI.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750.
SUMMARY
ALL FIVE PARTS PASSED THE ELECTRICAL TEST LIMITS AS
SPECIFIED IN THE DATASHEET AFTER IRRADIATION TO 1E12 N/cm2.
ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST.
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1.0
Overview and Background
Neutron particles incident on semiconductor materials lose energy along their paths. The energy
loss produces electron-hole pairs (ionization) and displaces atoms in the material lattice
(displacement damage defects or DDD). DDD induces a mixture of isolated and clustered
defects or broken bonds. Such defects elevate the energy level of the material and
consequently change material and electrical properties. The altering energy level creates the
combination of any of the following processes, thermal generation of electron-hole pairs,
recombination, trapping, compensation, tunneling, affecting hence the devices’ basic features.
We run the electrical tests after we had made sure that the parts are not radioactive anymore to
be shipped to LTC.
Bipolar technology is susceptible to neutron displacement damage around a fluence level of
1E12 neutron/cm2. The neutron radiation test for the RH3080MK determines the change in
device performance as a function of neutrons’ fluence.
2.0
Radiation Facility:
Five samples were irradiated unbiased at the University of Massachusetts, Lowell, using the
Reactor Facility-FNI. The neutron flux was determined by system S/P-32, method ASTM E-265,
to be 4.05E9 N/cm2-s (1MeV equivalent) for each irradiation step. Refer to Appendix C for the
certificate of dosimetry.
3.0
Test Conditions
Five samples and two control units were electrically tested at 25°C prior to irradiation. The
testing was performed on the two control units to confirm the operation of the test system prior
to the electrical testing of the 7 units (5 irradiated and 2 control). During irradiation, devices
leads were shorted together using anti-static foam and devices then were placed into an antistatic bag. Devices were then vertically aligned with the radiation source.
The criteria to pass the neutron displacement damage test is that five irradiated samples must
pass the datasheet limits. If any of the tested parameters of these five units do not meet the
required limits then a failure-analysis of the part should be conducted in accordance with
method 5003, MIL-STD-883, and if valid the lot will be scrapped.
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4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations:
-
SET Pin Current (uA) @ VIN = 1V, VCONTROL = 2V, ILOAD = 1mA
Output Offset Voltage (VOUT – VSET) (mV) @ VIN = 1V, VCONTROL = 2V, ILOAD = 1mA
Load Regulation, ISET (nA) @ ILOAD = 1mA to 0.9A
Load Regulation, VOS (mV) @ ILOAD = 1mA to 0.9A
Line Regulation, ISET (nA/V) @ VIN = 1V to 26V, VCONTROL = 2V to 26V, ILOAD = 1mA
Line Regulation, VOS (mV/V) @ VIN = 1V to 26V, VCONTROL = 2V to 26V, ILOAD = 1mA
Minimum Load Current (mA) @ VIN = 10V, VCONTROL = 10V
Minimum Load Current (mA) @ VIN = 26V, VCONTROL = 26V
VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 0.1A
VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 0.9A
VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 0.1A
VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 0.8A
VCONTROL Pin Current (mA) @ VIN = 1V, VCONTROL = 2V, ILOAD = 0.1A
VCONTROL Pin Current (mA) @ VIN = 1V, VCONTROL = 2V, ILOAD = 0.9A
Current Limit (A) @ VIN = 5V, VCONTROL = 5V, VSET = 0V, VOUT = - 0.1V
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
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5.0
Test Results
All five samples passed the post-irradiation electrical tests. All measurements of the fifteen
listed parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can
be calculated by adding to and subtracting from mean the product of standard deviation and the
tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability
distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
However, in most cases, mean and standard deviations are unknown and therefore it is
practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on
the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a
sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B).
The KTL factor in this report is 2.742.
In the plots, the dashed lines with X-markers are the measured data points of five postirradiated samples. The solid lines with square symbols are the computed KTL values of five
post-irradiated samples with the application of the KTL statistics. The orange solid lines with
circle markers are the datasheet specification limits.
The post-irradiation test limits are using Linear Technology datasheets 10 Krads(Si)
specification limits.
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10.25
Specification MAX
10.20
10.15
10.10
Ps90%/90% (+KTL) Un-biased
ISET (uA)
10.05
10.00
Average Un-biased
9.95
9.90
Ps90%/90% (-KTL) Un-biased
9.85
9.80
Specification MIN
9.75
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.1 Plot of SET Pin Current versus Total Fluence
All five samples pass the SET Pin Current parameter. Notice the –KTL point of pre-irradiation is
right at the minimum specification limit due to the small 5-piece sample size.
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Table 5.1: Raw data table for SET Pin Current of pre- and post-irradiation (1E12 N/cm2)
ISET
Total Fluence (neutron/cm 2)
Parameter
Units
(uA)
0
1.E+12
1 Un-biased Irradiation
9.9432
10.0165
2 Un-biased Irradiation
9.9539
10.0219
3 Un-biased Irradiation
9.9638
10.0333
4 Un-biased Irradiation
9.9718
10.0341
5 Un-biased Irradiation
10.0089
10.0790
11 Control Unit
9.9364
9.9311
12 Control Unit
9.9852
9.9875
Un-biased Irradiation Statistics
Average Un-biased
9.9683
10.0370
Std Dev Un-biased
0.0251
0.0247
Ps90%/90% (+KTL) Un-biased
10.0372
10.1046
Ps90%/90% (-KTL) Un-biased
9.8995
9.9693
Specification MIN
9.90
9.80
Status (Measurements)
PASS
PASS
Specification MAX
10.10
10.20
Status (Measurements)
PASS
PASS
Status (-KTL) Un-biased
Status (+KTL) Un-biased
FAIL
PASS
PASS
PASS
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10
Specification MAX
8
6
Ps90%/90% (+KTL) Un-biased
4
VOS (mV)
2
Average Un-biased
0
-2
-4
Ps90%/90% (-KTL) Un-biased
-6
-8
Specification MIN
-10
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.2: Plot of Output Offset Voltage versus Total Fluence
All measured data are within the datasheet specification limits.
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Table 5.2: Raw data table for Output Offset Voltage of pre- and post-irradiation (1E12 N/cm2)
VOS
Total Fluence (neutron/cm 2)
Parameter
Units
(mV)
0
1.E+12
1 Un-biased Irradiation
0.8622
1.2100
2 Un-biased Irradiation
1.7056
2.3800
3 Un-biased Irradiation
1.1254
1.5000
4 Un-biased Irradiation
1.6301
1.5800
5 Un-biased Irradiation
-0.3578
-0.2140
11 Control Unit
0.2691
0.3231
12 Control Unit
-0.5725
-0.5018
Un-biased Irradiation Statistics
Average Un-biased
0.9931
1.2912
Std Dev Un-biased
0.8326
0.9467
Ps90%/90% (+KTL) Un-biased
3.2761
3.8870
Ps90%/90% (-KTL) Un-biased
-1.2899
-1.3046
Specification MIN
-5
-8
Status (Measurements)
PASS
PASS
Specification MAX
5
8
Status (Measurements)
PASS
PASS
Status (-KTL) Un-biased
Status (+KTL) Un-biased
PASS
PASS
PASS
PASS
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20
Load Regulation ISET (nA)
15
Specification MAX
10
Ps90%/90% (+KTL) Un-biased
5
0
Average Un-biased
-5
Ps90%/90% (-KTL) Un-biased
-10
-15
Specification MIN
-20
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.3: Plot of Load Regulation ISET versus Total Fluence
All measured data points of Load Regulation ISET parameter are within datasheet specification
limits.
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Table 5.3: Raw data table for Load Regulation ISET of pre- and post-irradiation (1E12 N/cm2)
Load Regulation ISET
Total Fluence (neutron/cm 2 )
Parameter
Units
(nA)
0
1.E+12
1 Un-biased Irradiation
4.5820
-2.3800
2 Un-biased Irradiation
-1.6225
-2.2900
3 Un-biased Irradiation
0.0000
1.1400
4 Un-biased Irradiation
-1.9090
0.7630
5 Un-biased Irradiation
3.7289
0.1910
11 Control Unit
0.3820
6.3965
12 Control Unit
3.8181
-1.4315
Un-biased Irradiation Statistics
Average Un-biased
0.9559
-0.5152
Std Dev Un-biased
3.0252
1.6956
Ps90%/90% (+KTL) Un-biased
9.2511
4.1340
Ps90%/90% (-KTL) Un-biased
-7.3393
-5.1644
Specification MIN
-15
-15
Status (Measurements)
PASS
PASS
Specification MAX
15
15
Status (Measurements)
PASS
PASS
Status (-KTL) Un-biased
Status (+KTL) Un-biased
PASS
PASS
PASS
PASS
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1.50
Specification MAX
Load Regulation VOS (mV)
1.00
0.50
Ps90%/90% (+KTL) Unbiased
0.00
Average Un-biased
-0.50
Ps90%/90% (-KTL) Unbiased
-1.00
Specification MIN
-1.50
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.4: Plot of Load Regulation VOS versus Total Fluence
All post-irradiation measured values of Load Regulation VOS are within datasheet specification
limits.
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Table 5.4: Raw data table for Load Regulation VOS of pre- and post-irradiation (1E12 N/cm2)
Load Regulation VOS
Total Fluence (neutron/cm 2 )
Parameter
Units
(mV)
0
1.E+12
1 Un-biased Irradiation
-0.3701
-0.4070
2 Un-biased Irradiation
-0.3677
-0.4030
3 Un-biased Irradiation
-0.3450
-0.4040
4 Un-biased Irradiation
-0.3592
-0.4040
5 Un-biased Irradiation
-0.3740
-0.3910
11 Control Unit
-0.3400
-0.3780
12 Control Unit
-0.3391
-0.3618
Un-biased Irradiation Statistics
Average Un-biased
-0.3632
-0.4018
Std Dev Un-biased
0.0115
0.0062
Ps90%/90% (+KTL) Un-biased
-0.3316
-0.3847
Ps90%/90% (-KTL) Un-biased
-0.3948
-0.4189
Specification MIN
-1.00
-1.25
Status (Measurements)
PASS
PASS
Specification MAX
1.00
1.25
Status (Measurements)
PASS
PASS
Status (-KTL) Un-biased
Status (+KTL) Un-biased
PASS
PASS
PASS
PASS
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1.00
Specification MAX
Line Regulation ISET (nA/V)
0.80
0.60
0.40
Ps90%/90% (+KTL) Un-biased
0.20
0.00
Average Un-biased
-0.20
-0.40
Ps90%/90% (-KTL) Un-biased
-0.60
-0.80
Specification MIN
-1.00
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.5: Plot of Line Regulation versus Total Fluence
All measured post-irradiation data points are within datasheet specification limits.
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Table 5.5: Raw data table for Line Regulation ISET of pre- and post-irradiation (1E12 N/cm2)
Line Regulation ISET
Total Fluence (neutron/cm 2)
Parameter
Units
(nA/V)
0
1.E+12
1 Un-biased Irradiation
0.0955
0.0000
2 Un-biased Irradiation
-0.1313
-0.0953
3 Un-biased Irradiation
-0.0991
0.1230
4 Un-biased Irradiation
-0.1154
0.0159
5 Un-biased Irradiation
-0.0553
0.0676
11 Control Unit
-0.0676
0.3182
12 Control Unit
0.0875
-0.0795
Un-biased Irradiation Statistics
Average Un-biased
-0.0611
0.0222
Std Dev Un-biased
0.0920
0.0815
Ps90%/90% (+KTL) Un-biased
0.1912
0.2457
Ps90%/90% (-KTL) Un-biased
-0.3134
-0.2012
Specification MIN
-0.45
-0.80
Status (Measurements)
PASS
PASS
Specification MAX
0.45
0.80
Status (Measurements)
PASS
PASS
Status (-KTL) Un-biased
Status (+KTL) Un-biased
PASS
PASS
PASS
PASS
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0.08
Line Regulation VOS (mV/V)
0.06
Specification MAX
0.04
Ps90%/90% (+KTL) Un-biased
0.02
0.00
Average Un-biased
-0.02
Ps90%/90% (-KTL) Un-biased
-0.04
-0.06
Specification MIN
-0.08
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.6: Plot of Line Regulation VOS versus Total Fluence
All five samples pass the Line Regulation VOS post-irradiation test.
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Table 5.6: Raw data table for Line Regulation VOS of pre- and post-irradiation (1E12 N/cm2)
Line Regulation VOS
Total Fluence (neutron/cm 2)
Parameter
Units
(mV/V)
0
1.E+12
1 Un-biased Irradiation
0.0002
-0.0013
2 Un-biased Irradiation
0.0013
-0.0004
3 Un-biased Irradiation
0.0023
-0.0018
4 Un-biased Irradiation
0.0025
0.0016
5 Un-biased Irradiation
-0.0006
-0.0056
11 Control Unit
0.0022
0.0014
12 Control Unit
-0.0009
-0.0020
Un-biased Irradiation Statistics
Average Un-biased
0.0011
-0.0015
Std Dev Un-biased
0.0013
0.0026
Ps90%/90% (+KTL) Un-biased
0.0048
0.0057
Ps90%/90% (-KTL) Un-biased
-0.0025
-0.0087
Specification MIN
-0.05
-0.06
Status (Measurements)
PASS
PASS
Specification MAX
0.05
0.06
Status (Measurements)
PASS
PASS
Status (-KTL) Un-biased
Status (+KTL) Un-biased
PASS
PASS
PASS
PASS
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0.42
Min. Current Load @ VP=VC=10V (mA)
Specification MAX
0.40
0.38
Ps90%/90% (+KTL) Unbiased
0.36
Average Un-biased
0.34
0.32
Ps90%/90% (-KTL) Unbiased
0.30
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.7: Plot of Minimum Load with VIN and VCONTROL = 10V versus Total Fluence
All measured data points are well under datasheet upper limits.
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Table 5.7: Raw data table for Minimum Load Current of pre- and post-irradiation (1E12 N/cm2)
Parameter Miin Current Load @VP=VC=10V
Units
(mA)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
0.3176
0.3160
0.3193
0.3200
0.3157
0.3170
0.3137
0.3150
0.3172
0.3170
0.3260
0.3276
0.3182
0.3214
0.3167
0.0021
0.3225
0.3110
0.3170
0.0019
0.3221
0.3119
0.40
PASS
PASS
0.40
PASS
PASS
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Min Current Load @ VP=VC=26V
1.0
Specification MAX
0.9
0.8
Ps90%/90% (+KTL) Unbiased
0.7
0.6
Average Un-biased
0.5
Ps90%/90% (-KTL) Unbiased
0.4
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.8: Plot of Minimum Load Current with VIN = VCONTROL = 26V versus Total Fluence
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Table 5.8: Raw data table for Minimum Load Current of pre- and post-irradiation (1E12 N/cm2)
Parameter Min Current Load @VP=VC=26V
Units
(mA)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
0.4372
0.4410
0.4380
0.4430
0.4345
0.4400
0.4323
0.4370
0.4359
0.4420
0.4515
0.4545
0.4359
0.4405
0.4356
0.0023
0.4418
0.4293
0.4406
0.0023
0.4469
0.4343
0.90
PASS
PASS
0.90
PASS
PASS
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1.55
Specification MAX
VC Dropout Voltage @ IL=0.1A (V)
1.50
1.45
Ps90%/90% (+KTL) Un-biased
1.40
1.35
Average Un-biased
1.30
1.25
Ps90%/90% (-KTL) Un-biased
1.20
0
5E+11
1E+12
1.5E+12
Total Fluence (neutron/cm2)
Figure 5.9: Plot of VC Dropout Voltage (@VIN=1V, ILOAD= 0.1A) versus Total Fluence
The measured parameters are well under the specification maximum limit.
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Table 5.9: Raw data table for Dropout Voltage Control of pre- and post-irradiation (1E12 N/cm2)
Parameter VC Dropout Voltage @ IL = 0.1A
Units
(V)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
1.2262
1.2558
1.2254
1.2552
1.2233
1.2543
1.2257
1.2560
1.2217
1.2585
1.2541
1.2483
1.2257
1.2088
1.2244
0.0019
1.2297
1.2192
1.2560
0.0016
1.2603
1.2517
1.40
PASS
PASS
1.50
PASS
PASS
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1.52
Specification MAX
VC Dropout Voltage @ IL=0.9A (V)
1.50
1.48
1.46
Ps90%/90% (+KTL) Unbiased
1.44
1.42
Average Un-biased
1.40
1.38
1.36
Ps90%/90% (-KTL) Un-biased
1.34
1.32
0
5E+11
1E+12
1.5E+12
Total Fluence (neutron/cm2)
Figure 5.10: Plot of VC Dropout Voltage (@ VIN = 1V, ILOAD = 0.9A) versus Total Fluence
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Table 5.10: Raw data table for Dropout Voltage Control of pre- and post-irradiation (1E12
N/cm2)
Parameter VC Dropout Volrage @ IL=.9A
Units
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
1.3512
1.3591
1.3504
1.3586
1.3482
1.3550
1.3506
1.3579
1.3559
1.3628
1.3809
1.3741
1.3508
1.3395
1.3513
0.0028
1.3590
1.3435
1.3587
0.0028
1.3664
1.3510
1.50
PASS
PASS
1.50
PASS
PASS
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DDD RH3080MK H0923840 W3
0.21
Specification MAX
VIN Dropout Voltage @ IL = .1A (V)
0.19
0.17
Ps90%/90% (+KTL) Un-biased
0.15
0.13
Average Un-biased
0.11
0.09
Ps90%/90% (-KTL) Un-biased
0.07
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.11: Plot of VIN Dropout Voltage (@ VCONTROL = 2V ILOAD = 0.1A) versus Total Fluence
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Table 5.11: Raw data table for VIN Dropout Voltage of pre- and post-irradiation (1E12 N/cm2)
Parameter VIN Dropout Voltage @ IL=.1A
Units
(V)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
0.0807
0.0854
0.0811
0.0855
0.0811
0.0853
0.0818
0.0856
0.0805
0.0844
0.0809
0.0809
0.0807
0.0808
0.0810
0.0005
0.0824
0.0797
0.0852
0.0005
0.0866
0.0839
0.17
PASS
PASS
0.20
PASS
PASS
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VIN Dropout Voltage @ IL = .8A (V)
0.55
0.50
Specification MAX
0.45
Ps90%/90% (+KTL) Un-biased
0.40
Average Un-biased
0.35
Ps90%/90% (-KTL) Un-biased
0.30
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.12: Plot of VIN Dropout Voltage (@ VCONTROL = 2V ILOAD = 0.8A) versus Total Fluence
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Table 5.12: Raw data table for VIN Dropout Voltage of pre- and post-irradiation (1E12 N/cm2)
Parameter VIN Dropout Voltage @ IL =.8A
Units
(V)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
0.3586
0.3670
0.3633
0.3710
0.3579
0.3660
0.3637
0.3700
0.3530
0.3600
0.3554
0.3572
0.3583
0.3624
0.3593
0.0044
0.3714
0.3472
0.3668
0.0043
0.3787
0.3549
0.45
PASS
PASS
0.50
PASS
PASS
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5.50
CONTROL Pin Current @ IL = 0.1A
5.30
Specification MAX
5.10
4.90
Ps90%/90% (+KTL) Un-biased
4.70
4.50
4.30
Average Un-biased
4.10
3.90
3.70
Ps90%/90% (-KTL) Un-biased
3.50
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.13: Plot of CONTROL Pin Current (@ ILOAD = 0.1A) versus Total Fluence
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Table 5.13: Raw data table for CONTROL Pin Current of pre- and post-irradiation (1E12 N/cm2)
Parameter CONTROL Pin Current @IL=.1A
Units
(mA)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
4.4008
3.6500
4.4095
3.6700
4.3936
3.6800
4.3986
3.7400
4.4111
3.7300
4.3883
4.3763
4.4111
4.3906
4.4027
0.0074
4.4231
4.3824
3.6940
0.0391
3.8013
3.5867
5.30
PASS
PASS
5.30
PASS
PASS
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23
CONTROL Pin Current @ IL = .9A
22
Specification MAX
21
20
Ps90%/90% (+KTL) Un-biased
19
18
Average Un-biased
17
16
15
Ps90%/90% (-KTL) Un-biased
14
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.14: Plot of CONTROL Pin Current (@ ILOAD = 0.9A) versus Total Fluence
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Table 5.14: Raw data table for VCONTROL Pin Current of pre- and post-irradiation (1E12 N/cm2)
Parameter CONTROL Pin Current @IL=.9A
Units
(mA)
1 Un-biased Irradiation
2 Un-biased Irradiation
3 Un-biased Irradiation
4 Un-biased Irradiation
5 Un-biased Irradiation
11 Control Unit
12 Control Unit
Un-biased Irradiation Statistics
Average Un-biased
Std Dev Un-biased
Ps90%/90% (+KTL) Un-biased
Ps90%/90% (-KTL) Un-biased
Specification MIN
Status (Measurements)
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
Total Fluence (neutron/cm 2)
0
1.E+12
16.0540
15.0400
16.1292
15.0900
16.0952
15.0550
16.1126
15.1790
16.1254
15.1795
15.9669
15.7206
16.1560
15.7566
16.1033
0.0306
16.1872
16.0194
15.1087
0.0669
15.2922
14.9252
22
PASS
PASS
22
PASS
PASS
P a g e 33 | 41
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1.30
1.25
Ps90%/90% (+KTL) Un-biased
1.20
Current Limit (A)
1.15
Average Un-biased
1.10
1.05
Ps90%/90% (-KTL) Un-biased
1.00
0.95
Specification MIN
0.90
0.85
0.80
0
5E+11
1E+12
Total Fluence
(neutron/cm2)
1.5E+12
Figure 5.15: Plot of Current Limit versus Total Fluence
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Table 5.15: Raw data table for Current Limit of pre- and post-irradiation (1E12 N/cm2)
Current Limit
Parameter
Total Fluence (neutron/cm 2)
Units
(A)
0
1.E+12
1 Un-biased Irradiation
1.1250
1.1238
2 Un-biased Irradiation
1.1387
1.1356
3 Un-biased Irradiation
1.1265
1.1246
4 Un-biased Irradiation
1.1299
1.1285
5 Un-biased Irradiation
1.2056
1.2000
11 Control Unit
1.1142
1.1113
12 Control Unit
1.1270
1.1222
Un-biased Irradiation Statistics
Average Un-biased
1.1451
1.1425
Std Dev Un-biased
0.0342
0.0325
Ps90%/90% (+KTL) Un-biased
1.2389
1.2316
Ps90%/90% (-KTL) Un-biased
1.0513
1.0534
Specification MIN
0.90
0.90
Status (Measurements)
PASS
PASS
Specification MAX
Status (Measurements)
Status (-KTL) Un-biased
Status (+KTL) Un-biased
PASS
PASS
P a g e 35 | 41
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Appendix A
Pictures of one among five samples used in the test.
Figure A1: Top View showing date code
Figure A2: Bottom View showing serial number
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Appendix B
Radiation Bias Connection Table
Table B1: Unbias condition
Pin
1
2
3
4
5
Function
NC
SET
VCONTROL
IN
OUT = CASE
Connection / Bias
Float
Float
Float
Float
Float
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Figure B1: Pin-Out
P a g e 38 | 41
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Appendix C
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Appendix D
Table D1: Electrical Characteristics of Device-Under-Test Pre-Irradiation
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Table D2: Electrical Characteristics of Device-Under-Test Post-Irradiation
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