ELDRS_LDR_RH3083MK_Fab_Lot_HP201494_1_W2.pdf

TID LDR RH3083MK HP201494 W2
Total Ionization Dose (TID) Test Results of the
RH3083MK Adjustable 2.8A Single Resistor Low
Dropout Regulator @ Low Dose Rate (LDR)
LDR = 10 mrads(Si)/s
10 October 2014
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the S-Power Product Engineering and Design groups
from Linear Technology for their help with the board design and assembly as well as the
data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd
from Defense Microelectronics Activity (DMEA) for the extensive work for board setup
and continuous dosimetry monitoring throughout the ELDRS tests.
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LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
TID LDR Testing of the RH3083MK Adjustable 2.8A
Single Resistor Low Dropout Regulator
Part Type Tested: RH3083MK Adjustable 2.8A Single Resistor Low Dropout Regulator
Traceability Information: Fab Lot # HP201494.1; Wafer # 2. See photograph of unit under test
in Appendix A.
Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5
units for unbiased irradiation. Serial numbers 6-10 had all pins tied to ground during irradiation.
Serial numbers 1-5 were biased during irradiation. Serial numbers 11 and 12 were used as
control. See Appendix B for the radiation bias connection tables.
Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test
increments: 25 Krads(Si), 50 Krads(Si), 75 Krads(Si), 100 Krads(Si), 128 Krads(Si), 150
Krads(Si).
Radiation dose: 10 mrads(Si)/sec.
Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D.
Test Hardware and Software: LTX pre-irradiation test program EFR3083R.00; LTX postirradiation test program EFR3083R.00.
Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750.
SUMMARY
ALL 12 PARTS PASSED THE ELECTRICAL TEST LIMITS AS
SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION
INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER
REQUEST.
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TID LDR RH3083MK HP201494 W2
1.0
Overview and Background
Among other radiation effects, Total Ionizing Dose (TID) may affect circuits’ electrical
characteristics, causing parametric and/or functional failures in integrated circuits. During
gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge
trapping in the transistors’ dielectrics and interface regions, affecting hence the devices’ basic
features. Such effects warrant testing and monitoring of circuits to TID, after which annealing
and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and
process technology. Hence is the requirement per Condition D (for low-dose rates ranging from
less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 to not exceed the allowed time
from the end of an incremented irradiation and an electrical test to more than one hour.
Additionally, the total time from the end of one incremental irradiation to the start of the next
incremental step should be less than two hours.
2.0
Radiation Facility and Test Equipment
The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in
Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate
of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel
positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain
optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry.
3.0
Test Conditions
The 10 samples were placed in a lead/aluminum container and aligned with the radiation
source, Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were
biased at +3V and other five had all pads grounded. The devices were irradiated up to 150
Krad(Si) with increments of 25, 50, 75, 100, 128 Krads(Si). After each irradiation, the samples
were transported in dry ice to Linear Technology testing facility. Testing was performed on the
two control units to confirm the operation of the test system prior to the electrical testing of the
12 units (10 irradiated and 2 control).
The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias
must pass the datasheet limits. If any of the tested parameters of these five units do not meet
the required limits then a failure-analysis of the part should be conducted and if valid the lot will
be scrapped.
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TID LDR RH3083MK HP201494 W2
4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations:
-
SET Pin Current (uA)
Output Offset Voltage (mV)
Load Regulation ISET (nA)
Load Regulation VOS (mV)
Line Regulation ISET (nA/V)
Line Regulation VOS (mV/V)
Minimum Load Current (mA) @ VIN = 1V, VCONTROL = 2V
Minimum Load Current (mA) @ VIN = 23V, VCONTROL = 25V
VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 0.1A
VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 1A
VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 2.8A
VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 0.1A
VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 1A
VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 2.8A
VCONTROL Pin Current (mA) @ VIN = 1V,VCONTROL = 2V, ILOAD = 0.1A
VCONTROL Pin Current (mA) @ VIN = 1V,VCONTROL = 2V, ILOAD = 1A
VCONTROL Pin Current (mA) @ VIN = 1V,VCONTROL = 2V, ILOAD = 2.8A
Current Limit (A) @ VIN = 5V,VCONTROL = 5V, VOUT = -0.1V
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
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TID LDR RH3083MK HP201494 W2
5.0
Test Results
All ten samples passed the post-irradiation electrical tests. All measurements of the 18 listed
parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can
be calculated by adding to and subtracting from mean the product of standard deviation and the
tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability
distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
However, in most cases, mean and standard deviations are unknown and therefore it is
practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on
the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a
sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B).
The KTL factor in this report is 2.742.
In the plots, the dotted lines with diamond markers are the average of the measured data points
of five samples irradiated under electrical bias while the dashed lines with X-markers are the
average of measured data points of five units irradiated with all pins tied to ground. The solid
lines with triangle markers are the average of the data points after the calculation of the KTL
statistics on the sample irradiated in the biased setup. The solid lines with square symbols are
the average of the measured points after the application of the KTL statistics on the five samples
irradiated with all pins grounded. The orange solid lines with circle markers are the specification
limits.
The 25 Krads(Si) test limits are using Linear Technology datasheet 20 Krads(Si) specification
limits.
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TID LDR RH3083MK HP201494 W2
SET Pin Current (uA) @ VIN =1V, VC =2V, IL=1mA
51.50
Specification MAX
51.00
Ps90%/90% (+KTL) Biased
50.50
Ps90%/90% (+KTL) All GND'd
Average Biased
50.00
Average All GND'd
Ps90%/90% (-KTL) Biased
49.50
Ps90%/90% (-KTL) All GND'd
Specification MIN
49.00
48.50
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.1 Plot of SET Pin Current versus Total Dose
The measured data of 10 samples are within datasheet specification limits. Note the preirradiation computed +KTL data point is slightly higher than the maximum limit due to the small
5-piece sample size.
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Table 5.1: Raw data for SET Pin current versus total dose including the statistical calculations,
minimum specification, maximum specification, and the status of the test (PASS/FAIL) under the
orange headers)
Parameter ISET @VIN = 1V, VC = 2V, IL = 1mA
Units
(uA)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
49.7925
50.0863
49.9738
49.9879
50.2430
50.1162
49.9545
50.2078
50.1990
50.3661
50.2360
50.1286
25
49.8481
50.0732
49.9748
49.9607
49.9044
49.9607
49.9731
50.1595
50.2176
50.3846
50.2440
50.0961
50
49.7573
50.0493
49.9524
49.9366
49.8664
49.9736
49.9172
50.1197
50.1778
50.3448
50.2303
50.0897
75
49.8250
50.0640
49.9674
49.9779
49.8619
49.9744
49.9463
50.1466
50.2116
50.3486
50.1062
50.0991
100
49.7384
50.0413
49.9482
49.9449
49.8254
50.2435
49.8941
50.0909
50.2103
50.3382
50.2427
50.0908
128
49.7611
50.0553
49.9414
49.9518
49.8151
49.9688
49.9155
50.1021
50.2325
50.3470
50.2476
50.1035
150
49.7410
50.0384
49.9349
49.9426
49.7692
49.9667
49.8948
50.0914
50.2370
50.3478
50.2517
50.1018
50.0167 49.9522 49.9124 49.9392 49.8996 49.9049 49.8852
0.1651 0.0842 0.1085 0.0960 0.1183 0.1172 0.1260
50.4693 50.1831 50.2099 50.2025 50.2241 50.2262 50.2307
49.5641 49.7214 49.6148 49.6760 49.5752 49.5837 49.5397
50.1687 50.1391 50.1066 50.1255 50.1554 50.1132 50.1075
0.1500 0.1777 0.1699 0.1678 0.1708 0.1796 0.1869
50.5801 50.6262 50.5726 50.5855 50.6237 50.6055 50.6201
49.7573 49.6520 49.6406 49.6655 49.6871 49.6208 49.5949
49.5
49.0
49.0
49.0
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
50.5
51.0
51.0
51.0
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
FAIL
PASS
PASS
PASS
PASS
PASS
PASS
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TID LDR RH3083MK HP201494 W2
Output Offset V (mV) @ VIN = 1V, VC =2V,IL=1mA
8.00
Ps90%/90% (+KTL) All GND'd
6.00
Specification MAX
4.00
Ps90%/90% (+KTL) Biased
Average All GND'd
2.00
Average Biased
0.00
Ps90%/90% (-KTL) Biased
-2.00
Ps90%/90% (-KTL) All GND'd
-4.00
Specification MIN
-6.00
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.2: Plot of Output Offset Voltage versus Total Dose
The measured values of 10 samples are within datasheet specification limits. The +KTL All
GND’d computed data points at 128 and 150 Krads(Si) are higher than the maximum
specification limit due to the small 5-piece sample size.
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Table 5.2: Raw data for output offset voltage versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL under the second
orange header)
Parameter VOS @ VIN = 1V,VC = 2V,IL = 1mA
Units
(mV)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
-0.4226
0.0213
0.5932
-0.0423
0.2572
-0.5588
0.6675
0.5152
0.4733
0.6687
-0.2918
-0.2031
25
-0.6016
0.2596
0.5136
0.0260
0.3924
-0.4355
0.5062
0.4830
0.2987
0.3883
-0.2357
-0.0319
50
-0.4595
0.7541
0.6601
0.0239
0.5929
-0.2989
0.7138
0.6552
0.4262
0.5638
-0.2202
-0.0297
75
-0.6154
1.2556
0.5332
-0.1592
0.7016
-0.4318
0.4510
0.4078
0.0939
0.4909
-0.2257
-0.0932
100
-0.3170
2.5209
0.8648
0.0211
1.4121
-0.0097
0.6950
1.0733
0.1298
0.6877
-0.0051
0.0571
128
-0.3944
3.3617
0.8742
-0.1204
1.8887
-0.2064
0.5819
1.2094
-0.1370
0.5575
-0.0709
-0.0144
150
-0.3829
4.5978
0.9982
-0.1446
2.6578
-0.1589
0.5440
1.4539
-0.5235
0.5694
-0.0596
0.0148
0.0814
0.3761
1.1126
-0.9499
0.1180
0.4411
1.3275
-1.0914
0.3143
0.5181
1.7349
-1.1063
0.3432
0.7363
2.3620
-1.6757
0.9004
1.1341
4.0100
-2.2093
1.1220
1.5418
5.3495
-3.1056
1.5453
2.0874
7.2688
-4.1783
0.3532
0.5174
1.7719
-1.0655
-4.0
PASS
PASS
4.0
PASS
PASS
0.2481
0.3909
1.3200
-0.8238
-4.5
PASS
PASS
4.5
PASS
PASS
0.4120
0.4120
1.5416
-0.7176
-4.5
PASS
PASS
4.5
PASS
PASS
0.2024
0.3877
1.2654
-0.8606
0.5152
0.4465
1.7396
-0.7092
-4.5
PASS
PASS
4.5
PASS
PASS
0.4011
0.5850
2.0052
-1.2031
0.3770
0.7620
2.4664
-1.7125
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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TID LDR RH3083MK HP201494 W2
Load Regulation ISET (nA) @ IL = 1 mA to 2.8 A
400
Specification MAX
300
Ps90%/90% (+KTL) All GND'd
200
Ps90%/90% (+KTL) Biased
100
Average All GND'd
0
Average Biased
-100
Ps90%/90% (-KTL) Biased
-200
Ps90%/90% (-KTL) All GND'd
-300
Specification MIN
-400
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.3: Plot of Load Regulation ISET versus Total Dose
All measured post-irradiation data points are within the datasheet specification limits.
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TID LDR RH3083MK HP201494 W2
Table 5.3: Raw data for load regulation ISET versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL).
Parameter Load Reg. ISET @IL = 1 mA to 2.8A
Units
(nA)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
34.9101
50.9754
33.4403
25.0293
36.8164
41.8077
42.1715
40.0760
34.4007
26.0188
46.3187
31.2284
25
49.6075
47.1773
41.0946
33.6149
43.6266
49.9131
56.0249
34.9246
42.4043
33.1784
38.9846
36.5690
50
58.4405
52.0959
46.9590
40.7890
46.7844
48.7053
41.7786
36.2779
58.6006
59.5319
35.0992
34.5171
75
64.7560
63.7519
45.3001
47.9486
52.8671
53.6820
39.6103
53.2164
46.1150
49.1418
36.0305
37.2675
100
44.0778
51.2082
39.0428
40.3088
38.3298
34.8373
43.2046
44.7035
41.1965
41.9532
29.3367
32.1888
128
52.2414
44.0050
37.7768
44.6744
46.0277
40.3525
40.4980
45.8967
44.0341
39.7558
33.2657
28.3326
150
46.1878
50.4660
46.5079
45.9550
53.7111
42.3170
43.4666
50.8735
49.5202
49.0400
31.7668
26.9210
36.2343 43.0242 49.0138 54.9247 42.5935 44.9450 48.5656
9.3908 6.1889 6.6182 8.9458 5.3015 5.1660 3.4202
61.9839 59.9941 67.1608 79.4541 57.1301 59.1102 57.9438
10.4846 26.0543 30.8667 30.3954 28.0568 30.7799 39.1873
36.8949 43.2890 48.9788 48.3531 41.1790 42.1074 47.0434
6.8302 9.7346 10.2125 5.7904 3.7862 2.7051 3.8705
55.6233 69.9814 76.9814 64.2304 51.5609 49.5249 57.6564
18.1665 16.5967 20.9763 32.4758 30.7972 34.6899 36.4305
-200
-300
-300
-300
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
200
300
300
300
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Load Regulation VOS (mV) @ IL = 1 mA to 2.8A
4.0
Specification MAX
3.0
Ps90%/90% (+KTL) All
GND'd
2.0
Ps90%/90% (+KTL) Biased
1.0
Average All GND'd
0.0
Average Biased
-1.0
Ps90%/90% (-KTL) Biased
-2.0
Ps90%/90% (-KTL) All GND'd
-3.0
Specification MIN
-4.0
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.4: Plot of Load Regulation VOS versus Total Dose
All measured post-irradiation data points are within datasheet specification limits.
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Table 5.4: Raw data for load regulation VOS versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL).
Parameter Load Reg. VOS @IL = 1mA to 2.8A
Units
(mV)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
-0.0202
-0.0293
-0.0296
0.0379
0.0128
0.0118
-0.0207
-0.0640
-0.0527
-0.0040
0.0018
0.0003
25
0.0094
-0.0118
-0.0148
0.0517
-0.0180
0.0410
0.0147
-0.0378
-0.0166
0.0330
0.0157
0.0135
50
-0.0145
-0.0396
-0.0360
0.0418
-0.0306
0.0386
-0.0253
-0.0668
-0.0573
-0.0190
0.0152
0.0088
75
0.0086
-0.0158
-0.0103
0.0631
-0.0322
0.0489
0.0027
-0.0458
-0.0207
0.0114
0.0435
0.0266
100
-0.1213
-0.1492
-0.1392
-0.0749
-0.1591
-0.0617
-0.1326
-0.1971
-0.1535
-0.1191
-0.0715
-0.0619
128
-0.1220
-0.1315
-0.1428
-0.0682
-0.1442
-0.0785
-0.1206
-0.1837
-0.1436
-0.1192
-0.0626
-0.0427
150
-0.1384
-0.1952
-0.1552
-0.1175
-0.1652
-0.0774
-0.1321
-0.1942
-0.1714
-0.1461
-0.0668
-0.0577
-0.0057
0.0299
0.0764
-0.0877
0.0033
0.0291
0.0831
-0.0765
-0.0158
0.0336
0.0764
-0.1079
0.0027
0.0368
0.1036
-0.0982
-0.1287
0.0332
-0.0377
-0.2198
-0.1218
0.0313
-0.0360
-0.2075
-0.1543
0.0291
-0.0744
-0.2342
-0.0259
0.0320
0.0618
-0.1137
-3.0
PASS
PASS
3.0
PASS
PASS
0.0068
0.0334
0.0984
-0.0847
-3.5
PASS
PASS
3.5
PASS
PASS
-0.0260
0.0414
0.0877
-0.1396
-3.5
PASS
PASS
3.5
PASS
PASS
-0.0007
0.0355
0.0967
-0.0981
-0.1328
0.0495
0.0030
-0.2685
-3.5
PASS
PASS
3.5
PASS
PASS
-0.1291
0.0385
-0.0236
-0.2346
-0.1442
0.0443
-0.0228
-0.2657
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
P a g e 13 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Line Regulation ISET (nA/V) @ VC = 2V to 25V
15.00
Specification MAX
10.00
Ps90%/90% (+KTL) All GND'd
5.00
Ps90%/90% (+KTL) Biased
Average All GND'd
0.00
Average Biased
Ps90%/90% (-KTL) Biased
-5.00
Ps90%/90% (-KTL) All GND'd
Specification MIN
-10.00
-15.00
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.5: Plot of Line Regulation ISET versus Total Dose
The measured parameters are over the specification minimum limits.
P a g e 14 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.5: Raw data for line regulation ISET versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL)
Parameter Line Reg. ISET @ VC = 2V to 25V
Units
(nA/V)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.6118
1.1477
1.7595
1.7608
1.3008
1.6070
1.2249
1.5305
1.7601
1.8373
1.6070
1.4546
25
1.1490
1.4539
1.7601
1.1477
1.4539
0.5353
1.6836
1.8373
1.3774
1.3780
1.5311
1.2243
50
1.3014
1.6836
1.8367
1.8361
1.3014
1.6083
1.5975
1.7595
1.2249
1.2249
1.6741
2.0664
75
1.1471
1.1458
1.2989
1.2224
1.0692
1.2217
1.5280
1.0686
1.5280
1.2217
1.6804
1.7564
100
0.7023
0.4808
0.6896
0.5473
0.7523
1.1116
0.5802
0.5327
0.7845
0.7308
1.0863
0.9604
128
0.7206
0.4606
0.6801
0.6131
0.6390
0.5239
0.5909
0.4872
0.7864
0.5625
0.8257
0.9092
150
0.7301
0.6441
0.8541
0.6276
0.8244
0.6257
0.8605
0.6523
0.9661
0.9440
1.3653
1.1534
1.3161
0.4793
2.6304
0.0018
1.3929
0.2559
2.0946
0.6913
1.5919
0.2723
2.3386
0.8451
1.1767
0.0872
1.4157
0.9376
0.6345
0.1148
0.9493
0.3197
0.6227
0.0994
0.8953
0.3501
0.7361
0.1025
1.0170
0.4551
1.5920
0.2384
2.2455
0.9384
-8
PASS
PASS
8
PASS
PASS
1.3623
0.5033
2.7424
-0.0178
-10
PASS
PASS
10
PASS
PASS
1.4830
0.2442
2.1526
0.8135
-10
PASS
PASS
10
PASS
PASS
1.3136
0.2054
1.8769
0.7503
0.7480
0.2282
1.3738
0.1221
-10
PASS
PASS
10
PASS
PASS
0.5902
0.1165
0.9096
0.2707
0.8097
0.1610
1.2512
0.3682
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
P a g e 15 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Line Regulation VOS (mV/V) @ VC = 2V to 25V
0.040
Specification MAX
0.030
Ps90%/90% (+KTL) Biased
0.020
Ps90%/90% (+KTL) All GND'd
0.010
Average Biased
0.000
Average All GND'd
-0.010
Ps90%/90% (-KTL) All GND'd
-0.020
Ps90%/90% (-KTL) Biased
-0.030
Specification MIN
-0.040
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.6: Plot of Line Regulation VOS versus Total Dose
The data of five samples are within the datasheet specification limits.
P a g e 16 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.6: Raw data for line regulation VOS versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL)
Parameter Line Reg. VOS @ VC = 2V to 25V
Units
(mV/V)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.0054
0.0058
0.0058
0.0057
0.0065
0.0065
0.0056
0.0049
0.0065
0.0053
0.0065
0.0064
25
0.0062
0.0076
0.0073
0.0072
0.0063
0.0075
0.0066
0.0069
0.0075
0.0067
0.0066
0.0062
50
0.0066
0.0077
0.0077
0.0068
0.0070
0.0079
0.0072
0.0089
0.0081
0.0078
0.0068
0.0060
75
0.0077
0.0091
0.0088
0.0073
0.0074
0.0092
0.0074
0.0113
0.0086
0.0073
0.0063
0.0062
100
0.0047
0.0073
0.0063
0.0027
0.0045
0.0035
0.0031
0.0118
0.0053
0.0037
0.0038
0.0029
128
0.0058
0.0077
0.0081
0.0017
0.0056
0.0078
0.0025
0.0139
0.0067
0.0033
0.0043
0.0030
150
0.0047
0.0100
0.0091
0.0006
0.0053
0.0072
0.0015
0.0159
0.0068
0.0033
0.0040
0.0036
0.0059
0.0004
0.0070
0.0047
0.0069
0.0006
0.0086
0.0053
0.0072
0.0005
0.0086
0.0057
0.0081
0.0008
0.0104
0.0058
0.0051
0.0018
0.0100
0.0003
0.0058
0.0025
0.0128
-0.0012
0.0059
0.0038
0.0163
-0.0044
0.0057
0.0007
0.0077
0.0038
-0.020
PASS
PASS
0.020
PASS
PASS
0.0071
0.0004
0.0082
0.0059
-0.025
PASS
PASS
0.025
PASS
PASS
0.0080
0.0006
0.0097
0.0062
-0.025
PASS
PASS
0.025
PASS
PASS
0.0088
0.0016
0.0132
0.0043
0.0055
0.0036
0.0154
-0.0045
-0.030
PASS
PASS
0.030
PASS
PASS
0.0068
0.0045
0.0192
-0.0056
0.0069
0.0055
0.0221
-0.0082
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
P a g e 17 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Minimum IL (mA) @ VIN=1V, VC=2V
0.55
0.50
Specification MAX
Ps90%/90% (+KTL) All GND'd
0.45
Ps90%/90% (+KTL) Biased
0.40
Average All GND'd
Average Biased
0.35
Ps90%/90% (-KTL) All GND'd
0.30
Ps90%/90% (-KTL) Biased
0.25
0.20
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.7: Plot of Minimum Load Current IL (@ VCONTROL = 2V) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 18 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.7: Raw data table for minimum load current (at VCONTROL = 2V) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL)
Parameter
Units
6
7
8
9
10
1
2
3
4
5
11
12
Min IL @ VIN=1V,VC=2V
(mA)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.3966
0.3906
0.4014
0.3912
0.4014
0.3823
0.3912
0.4055
0.4055
0.3775
0.3745
0.3823
25
0.3600
0.3988
0.3701
0.3606
0.3820
0.3820
0.3659
0.3898
0.3988
0.3970
0.3850
0.3803
50
0.3839
0.3839
0.3785
0.3940
0.3911
0.3761
0.3976
0.3785
0.3976
0.3976
0.3696
0.3887
75
0.3368
0.3440
0.3422
0.3493
0.3249
0.3249
0.3279
0.3207
0.3333
0.3344
0.3660
0.3607
100
0.3292
0.3276
0.3324
0.3279
0.3311
0.3418
0.3260
0.3170
0.3308
0.3287
0.3416
0.3419
128
0.3281
0.3242
0.3324
0.3239
0.3293
0.3240
0.3227
0.3124
0.3260
0.3250
0.3419
0.3416
150
0.3247
0.3199
0.3313
0.3191
0.3260
0.3191
0.3186
0.3049
0.3237
0.3198
0.3418
0.3418
0.3962
0.0052
0.4106
0.3819
0.3743
0.0163
0.4191
0.3295
0.3863
0.0062
0.4033
0.3692
0.3394
0.0093
0.3649
0.3140
0.3296
0.0021
0.3353
0.3239
0.3276
0.0036
0.3375
0.3177
0.3242
0.0050
0.3378
0.3106
0.3924
0.0130
0.4280
0.3569
0.3867
0.0134
0.4233
0.3501
0.3895
0.0111
0.4201
0.3590
0.3283
0.0057
0.3440
0.3125
0.3289
0.0090
0.3535
0.3043
0.3220
0.0055
0.3371
0.3069
0.3173
0.0072
0.3369
0.2976
0.5
PASS
PASS
0.5
PASS
PASS
0.5
PASS
PASS
0.5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 19 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Minimum IL (mA) @ VIN=23V, VC=25V, VOUT=0.1V
1.10
Specification MAX
1.00
Ps90%/90% (+KTL) All GND'd
0.90
Ps90%/90% (+KTL) Biased
0.80
Average All GND'd
0.70
Average Biased
0.60
Ps90%/90% (-KTL) All GND'd
0.50
Ps90%/90% (-KTL) Biased
0.40
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.8: Plot of Minimum Load Current IL (@ VCONTROL = 25V) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 20 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.8: Raw data table for minimum load current (at VCONTROL = 25V) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL)
Parameter Min IL @VIN=23V,VC=25V,VOUT =.1V
Units
(mA)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.5540
0.5820
0.5916
0.5802
0.5772
0.5874
0.5642
0.5707
0.5963
0.5874
0.5683
0.5749
25
0.5604
0.5783
0.5616
0.5633
0.5717
0.5759
0.5538
0.5896
0.5842
0.5878
0.5783
0.5896
50
0.5550
0.5746
0.5841
0.5692
0.5841
0.5794
0.5746
0.5603
0.5931
0.5746
0.5626
0.5925
75
0.5209
0.5346
0.5382
0.5305
0.5209
0.5221
0.5346
0.5090
0.5221
0.5495
0.5209
0.5328
100
0.5287
0.5391
0.5448
0.5322
0.5394
0.5355
0.5278
0.5215
0.5347
0.5412
0.5349
0.5353
128
0.5265
0.5375
0.5447
0.5288
0.5382
0.5254
0.5255
0.5156
0.5327
0.5367
0.5343
0.5323
150
0.5280
0.5380
0.5468
0.5268
0.5401
0.5251
0.5235
0.5119
0.5332
0.5365
0.5346
0.5340
0.5770
0.0139
0.6152
0.5388
0.5670
0.0077
0.5881
0.5460
0.5734
0.0121
0.6067
0.5401
0.5290
0.0079
0.5507
0.5074
0.5368
0.0064
0.5543
0.5193
0.5351
0.0074
0.5555
0.5148
0.5359
0.0085
0.5592
0.5127
0.5812
0.0133
0.6177
0.5448
0.5783
0.0147
0.6185
0.5381
0.5764
0.0118
0.6086
0.5441
0.5275
0.0153
0.5694
0.4855
0.5321
0.0076
0.5531
0.5112
0.5272
0.0081
0.5493
0.5051
0.5260
0.0096
0.5523
0.4998
1
PASS
PASS
1
PASS
PASS
1
PASS
PASS
1
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 21 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VC Dropout Voltage (V) @ VIN=1V, IL=0.1A
1.45
Specification MAX
Ps90%/90% (+KTL) All GND'd
1.40
Ps90%/90% (+KTL) Biased
Average All GND'd
1.35
Average Biased
1.30
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) All GND'd
1.25
1.20
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.9: Plot of VCONTROL Dropout Voltage (@ ILOAD = 0.1A) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 22 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.9: Raw data table for VCONTROL Dropout Voltage (@ ILOAD = 0.1A) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL)
Parameter VC Dropout @ VIN = 1V,IL = 0.1A
Units
(V)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiaiton
2
Biased Irradiaiton
3
Biased Irradiaiton
4
Biased Irradiaiton
5
Biased Irradiaiton
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
1.2467
1.2313
1.2342
1.2480
1.2389
1.2491
1.2472
1.2485
1.2489
1.2450
1.2340
1.2355
25
1.2862
1.2694
1.2729
1.2661
1.2721
1.2617
1.2836
1.2826
1.2866
1.2829
1.2387
1.2362
50
1.2611
1.2509
1.2537
1.2646
1.2618
1.2626
1.2617
1.2656
1.2634
1.2630
1.2331
1.2327
75
1.3057
1.2878
1.2939
1.3043
1.2963
1.2936
1.2964
1.3089
1.2900
1.2905
1.2704
1.2477
100
1.2712
1.2624
1.2639
1.2746
1.2743
1.2370
1.2667
1.2673
1.2675
1.2636
1.2369
1.2379
128
1.2886
1.2820
1.2794
1.2902
1.2913
1.2782
1.2807
1.2804
1.2786
1.2784
1.2509
1.2523
150
1.2878
1.2790
1.2807
1.2903
1.2940
1.2729
1.2779
1.2770
1.2743
1.2726
1.2409
1.2442
1.2398
0.0074
1.2601
1.2196
1.2733
0.0077
1.2943
1.2524
1.2584
0.0058
1.2744
1.2425
1.2976
0.0074
1.3180
1.2772
1.2693
0.0058
1.2851
1.2534
1.2863
0.0053
1.3007
1.2718
1.2863
0.0064
1.3038
1.2689
1.2477
0.0017
1.2524
1.2431
1.2795
0.0101
1.3071
1.2519
1.2632
0.0015
1.2672
1.2593
1.2959
0.0077
1.3170
1.2747
1.2604
0.0132
1.2966
1.2242
1.2793
0.0012
1.2826
1.2759
1.2749
0.0024
1.2816
1.2683
1.40
PASS
PASS
1.41
PASS
PASS
1.42
PASS
PASS
1.43
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 23 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
1.50
VC Dropout Voltage (V) @ VIN =1V,IL =1A
Specification MAX
1.45
Ps90%/90% (+KTL) All GND'd
1.40
Ps90%/90% (+KTL) Biased
1.35
Average All GND'd
Average Biased
1.30
Ps90%/90% (-KTL) All GND'd
1.25
Ps90%/90% (-KTL) Biased
1.20
1.15
1.10
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.10: Plot of VCONTROL Dropout Voltage (@ ILOAD = 1A) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 24 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.10: Raw data table for VCONTROL Dropout Voltage (@ ILOAD = 1A) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL)
Parameter
Units
6
7
8
9
10
1
2
3
4
5
11
12
Dropout VC @ VIN = 1V,IL = 1A
(V)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
1.2483
1.2334
1.2362
1.2483
1.2404
1.2512
1.2480
1.2499
1.2503
1.2471
1.2347
1.2364
25
1.2880
1.2716
1.2749
1.2671
1.2742
1.2638
1.2856
1.2833
1.2887
1.2850
1.2402
1.2365
50
1.2636
1.2537
1.2565
1.2673
1.2576
1.2654
1.2646
1.2672
1.2648
1.2655
1.2334
1.2349
75
1.3077
1.2902
1.2963
1.3067
1.2986
1.2957
1.2988
1.3117
1.2924
1.2920
1.2720
1.2481
100
1.2735
1.2648
1.2667
1.2772
1.2771
1.2391
1.2695
1.2707
1.2706
1.2670
1.2390
1.2387
128
1.2912
1.2836
1.2808
1.2917
1.2926
1.2799
1.2837
1.2838
1.2814
1.2804
1.2519
1.2547
150
1.2904
1.2820
1.2836
1.2934
1.2968
1.2762
1.2813
1.2807
1.2774
1.2760
1.2413
1.2444
1.2413
0.0068
1.2601
1.2225
1.2752
0.0078
1.2966
1.2538
1.2598
0.0056
1.2750
1.2445
1.2999
0.0073
1.3200
1.2798
1.2719
0.0058
1.2878
1.2559
1.2880
0.0054
1.3027
1.2733
1.2892
0.0063
1.3066
1.2719
1.2493
0.0017
1.2539
1.2447
1.2813
0.0100
1.3086
1.2540
1.2655
0.0010
1.2684
1.2626
1.2981
0.0081
1.3202
1.2760
1.2634
0.0137
1.3008
1.2259
1.2818
0.0018
1.2868
1.2768
1.2783
0.0025
1.2853
1.2714
1.45
PASS
PASS
1.46
PASS
PASS
1.47
PASS
PASS
1.48
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 25 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
1.55
VC Dropout Voltage (V) @ VIN =1V, IL = 2.8A
Specification MAX
1.50
Ps90%/90% (+KTL) All GND'd
1.45
Ps90%/90% (+KTL) Biased
1.40
Average All GND'd
1.35
Average Biased
Ps90%/90% (-KTL) All GND'd
1.30
Ps90%/90% (-KTL) Biased
1.25
1.20
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.11: Plot of VCONTROL Dropout Voltage (@ ILOAD = 2.8A) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 26 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.11: Raw data table for VCONTROL Dropout Voltage (@ ILOAD = 2.8A) versus total dose
including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL)
Parameter
Units
6
7
8
9
10
1
2
3
4
5
11
12
VC Dropout @ VIN=1V,IL=2.8A
(V)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
1.2590
1.2509
1.2577
1.2649
1.2540
1.2606
1.2596
1.2596
1.2591
1.2566
1.2588
1.2575
25
1.2975
1.2824
1.2855
1.2783
1.2824
1.2740
1.2967
1.2935
1.2962
1.2925
1.2604
1.2544
50
1.2724
1.2645
1.2666
1.2781
1.2716
1.2758
1.2768
1.2788
1.2748
1.2746
1.2532
1.2504
75
1.3172
1.3008
1.3060
1.3168
1.3066
1.3049
1.3099
1.3221
1.3012
1.3030
1.2822
1.2624
100
1.2838
1.2771
1.2781
1.2869
1.2857
1.2552
1.2828
1.2833
1.2802
1.2770
1.2550
1.2521
128
1.3013
1.2957
1.2934
1.3029
1.3026
1.2905
1.2974
1.2983
1.2927
1.2920
1.2709
1.2692
150
1.3007
1.2946
1.2950
1.3038
1.3055
1.2872
1.2964
1.2965
1.2894
1.2885
1.2567
1.2558
1.2573
0.0053
1.2718
1.2428
1.2852
0.0073
1.3054
1.2651
1.2707
0.0053
1.2853
1.2560
1.3095
0.0072
1.3293
1.2897
1.2823
0.0045
1.2946
1.2701
1.2992
0.0043
1.3110
1.2873
1.2999
0.0050
1.3136
1.2862
1.2591
0.0015
1.2632
1.2550
1.2906
0.0094
1.3165
1.2647
1.2761
0.0017
1.2809
1.2714
1.3082
0.0084
1.3313
1.2851
1.2757
0.0117
1.3079
1.2435
1.2942
0.0035
1.3037
1.2847
1.2916
0.0045
1.3039
1.2792
1.50
PASS
PASS
1.51
PASS
PASS
1.52
PASS
PASS
1.53
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 27 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VIN Dropout Voltage (V) @ VC = 2V, IL = 0.1A
0.050
0.045
Specification MAX
0.040
Ps90%/90% (+KTL) Biased
0.035
Ps90%/90% (+KTL) All GND'd
0.030
Average Biased
0.025
Average All GND'd
0.020
Ps90%/90% (-KTL) All GND'd
0.015
Ps90%/90% (-KTL) Biased
0.010
0.005
0.000
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.12: Plot of VIN Dropout Voltage (@ ILOAD = 0.1A) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 28 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.12: Raw data table for VIN Dropout Voltage (@ ILOAD = 0.1A) versus total dose including
the statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter VIN Dropout @ VC = 2V,IL = 0.1A
Units
(V)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiaiton
2
Biased Irradiaiton
3
Biased Irradiaiton
4
Biased Irradiaiton
5
Biased Irradiaiton
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.0168
0.0165
0.0167
0.0174
0.0173
0.0173
0.0168
0.0167
0.0168
0.0168
0.0162
0.0168
25
0.0188
0.0185
0.0187
0.0189
0.0186
0.0188
0.0189
0.0189
0.0188
0.0189
0.0165
0.0169
50
0.0184
0.0186
0.0187
0.0193
0.0193
0.0194
0.0190
0.0197
0.0188
0.0192
0.0161
0.0166
75
0.0203
0.0203
0.0204
0.0210
0.0206
0.0210
0.0209
0.0221
0.0203
0.0207
0.0179
0.0173
100
0.0197
0.0205
0.0200
0.0208
0.0205
0.0162
0.0208
0.0221
0.0203
0.0219
0.0163
0.0167
128
0.0209
0.0220
0.0211
0.0220
0.0218
0.0220
0.0220
0.0238
0.0214
0.0219
0.0167
0.0173
150
0.0209
0.0226
0.0211
0.0222
0.0223
0.0221
0.0222
0.0243
0.0215
0.0221
0.0160
0.0166
0.0169
0.0004
0.0180
0.0159
0.0187
0.0002
0.0191
0.0182
0.0189
0.0004
0.0200
0.0178
0.0205
0.0003
0.0214
0.0197
0.0203
0.0004
0.0215
0.0191
0.0216
0.0005
0.0230
0.0201
0.0218
0.0007
0.0239
0.0198
0.0169
0.0002
0.0175
0.0162
0.0189
0.0001
0.0190
0.0187
0.0192
0.0003
0.0201
0.0183
0.0210
0.0007
0.0228
0.0192
0.0203
0.0024
0.0269
0.0136
0.0222
0.0009
0.0247
0.0197
0.0224
0.0011
0.0254
0.0195
0.035
PASS
PASS
0.040
PASS
PASS
0.040
PASS
PASS
0.045
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 29 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VIN Dropout Voltage (V) @ VC = 2V, IL = 1A
0.240
Specification MAX
0.220
Ps90%/90% (+KTL) All GND'd
0.200
Ps90%/90% (+KTL) Biased
Average All GND'd
0.180
Average Biased
0.160
Ps90%/90% (-KTL) Biased
0.140
Ps90%/90% (-KTL) All GND'd
0.120
0.100
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.13: Plot of VIN Dropout Voltage (@ ILOAD = 1A) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 30 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.13: Raw data table for VIN Dropout Voltage (@ ILOAD = 1A) versus total dose including
the statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter
Units
6
7
8
9
10
1
2
3
4
5
11
12
VIN Dropout @VC = 2V,IL = 1A
(V)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.1414
0.1403
0.1448
0.1459
0.1425
0.1441
0.1421
0.1426
0.1419
0.1439
0.1400
0.1429
25
0.1393
0.1384
0.1433
0.1470
0.1435
0.1460
0.1406
0.1424
0.1397
0.1414
0.1396
0.1436
50
0.1437
0.1428
0.1476
0.1488
0.1472
0.1472
0.1449
0.1466
0.1440
0.1456
0.1395
0.1431
75
0.1401
0.1406
0.1443
0.1459
0.1446
0.1451
0.1422
0.1432
0.1425
0.1439
0.1393
0.1418
100
0.1457
0.1462
0.1500
0.1511
0.1495
0.1385
0.1476
0.1507
0.1464
0.1486
0.1385
0.1422
128
0.1461
0.1473
0.1507
0.1520
0.1508
0.1506
0.1484
0.1519
0.1474
0.1491
0.1378
0.1411
150
0.1467
0.1493
0.1511
0.1529
0.1520
0.1512
0.1488
0.1531
0.1481
0.1499
0.1378
0.1411
0.1430
0.0023
0.1494
0.1366
0.1423
0.0035
0.1519
0.1327
0.1460
0.0026
0.1532
0.1389
0.1431
0.0026
0.1502
0.1360
0.1485
0.0024
0.1551
0.1419
0.1494
0.0026
0.1564
0.1424
0.1504
0.0024
0.1571
0.1437
0.1429
0.0010
0.1457
0.1401
0.1420
0.0025
0.1487
0.1353
0.1456
0.0013
0.1492
0.1421
0.1434
0.0012
0.1466
0.1402
0.1464
0.0047
0.1592
0.1336
0.1495
0.0018
0.1543
0.1446
0.1502
0.0020
0.1556
0.1448
0.220
PASS
PASS
0.225
PASS
PASS
0.225
PASS
PASS
0.225
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 31 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VIN Dropout Voltage (V) @ VC = 2V, IL = 2.8A
0.700
Specification MAX
0.650
Ps90%/90% (+KTL) All GND'd
0.600
Ps90%/90% (+KTL) Biased
0.550
Average All GND'd
Average Biased
0.500
Ps90%/90% (-KTL) Biased
0.450
Ps90%/90% (-KTL) All GND'd
0.400
0.350
0.300
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.14: Plot of VIN Dropout Voltage (@ ILOAD = 2.8A) versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 32 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.14: Raw data table for VIN Dropout Voltage (@ ILOAD = 2.8A) versus total dose including
the statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter
Units
6
7
8
9
10
1
2
3
4
5
11
12
VIN Dropout @VC = 2V,IL = 2.8A
(V)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Biased Irradiaiton
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
0.4352
0.4313
0.4552
0.4545
0.4379
0.4450
0.4384
0.4429
0.4365
0.4451
0.4322
0.4443
25
0.4208
0.4175
0.4424
0.4527
0.4395
0.4464
0.4250
0.4335
0.4210
0.4286
0.4299
0.4460
50
0.4352
0.4304
0.4553
0.4550
0.4489
0.4466
0.4382
0.4440
0.4346
0.4407
0.4294
0.4433
75
0.4173
0.4172
0.4383
0.4389
0.4350
0.4349
0.4232
0.4248
0.4244
0.4300
0.4257
0.4376
100
0.4380
0.4353
0.4591
0.4587
0.4520
0.4259
0.4417
0.4502
0.4381
0.4465
0.4261
0.4404
128
0.4367
0.4356
0.4594
0.4592
0.4532
0.4519
0.4417
0.4504
0.4390
0.4454
0.4228
0.4359
150
0.4371
0.4385
0.4585
0.4592
0.4540
0.4514
0.4409
0.4512
0.4392
0.4461
0.4238
0.4363
0.4428
0.0112
0.4736
0.4121
0.4346
0.0150
0.4756
0.3936
0.4450
0.0115
0.4766
0.4134
0.4293
0.0111
0.4599
0.3988
0.4486
0.0113
0.4797
0.4176
0.4488
0.0118
0.4813
0.4164
0.4495
0.0109
0.4792
0.4197
0.4416
0.0039
0.4524
0.4308
0.4309
0.0098
0.4578
0.4040
0.4408
0.0047
0.4538
0.4278
0.4275
0.0049
0.4409
0.4141
0.4405
0.0093
0.4661
0.4149
0.4457
0.0055
0.4607
0.4306
0.4458
0.0057
0.4613
0.4302
0.650
PASS
PASS
0.655
PASS
PASS
0.655
PASS
PASS
0.660
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 33 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VC Pin Current (mA) @ VIN = 1V, VC = 2V, IL =.1A
11.00
Specification MAX
10.00
Ps90%/90% (+KTL) Biased
9.00
Average Biased
Ps90%/90% (+KTL) All GND'd
8.00
Average All GND'd
7.00
Ps90%/90% (-KTL) Biased
6.00
Ps90%/90% (-KTL) All GND'd
5.00
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.15: Plot of VCONTROL Pin Current (@ ILOAD = 0.1A) versus Total Dose
The measured data points are within the datasheet specification maximum limit.
P a g e 34 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.15: Raw data table for VCONTROL Pin Current (@ ILOAD = 0.1A) versus total dose including
the statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter VC pin I @ VIN=1V, VC=2V, IL=0.1A
Units
(mA)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiaiton
2
Biased Irradiaiton
3
Biased Irradiaiton
4
Biased Irradiaiton
5
Biased Irradiaiton
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
5.9877
5.9864
5.8927
5.8652
5.8025
5.9128
6.0019
5.9809
5.9721
5.9950
5.8851
5.8904
25
5.9528
5.9374
5.9308
5.8858
5.9286
5.9140
6.0251
5.9931
5.9506
5.9815
5.9784
5.9762
50
5.8754
5.8352
5.8338
5.8238
5.8464
5.8827
5.9560
5.9243
5.8901
5.9044
5.9683
5.9754
75
5.8910
5.8456
5.8550
5.8304
5.8456
5.8962
5.9829
5.9493
5.8987
5.9223
6.0427
6.0138
100
5.7781
5.7085
5.7286
5.7258
5.7359
6.0032
5.8739
5.8367
5.8253
5.8207
6.0003
5.9984
128
5.7517
5.6699
5.6858
5.6827
5.6836
5.7932
5.8535
5.8118
5.8039
5.8051
6.0214
6.0214
150
5.6875
5.5925
5.6205
5.6187
5.6129
5.7538
5.8144
5.7647
5.7618
5.7575
6.0102
6.0138
5.9069
0.0801
6.1266
5.6872
5.9271
0.0249
5.9955
5.8587
5.8429
0.0199
5.8974
5.7885
5.8535
0.0227
5.9159
5.7912
5.7354
0.0259
5.8065
5.6643
5.6948
0.0324
5.7837
5.6058
5.6264
0.0359
5.7249
5.5279
5.9725
0.0354
6.0695
5.8756
5.9729
0.0423
6.0889
5.8568
5.9115
0.0295
5.9924
5.8306
5.9299
0.0366
6.0302
5.8296
5.8720
0.0763
6.0812
5.6628
5.8135
0.0233
5.8775
5.7496
5.7705
0.0249
5.8388
5.7021
10.0
PASS
PASS
10.1
PASS
PASS
10.2
PASS
PASS
10.5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 35 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VC Pin Current (mA)@ VIN = 1V, VC = 2V, IL = 1A
45.00
Specification MAX
40.00
Ps90%/90% (+KTL) Biased
35.00
Ps90%/90% (+KTL) All GND'd
30.00
Average All GND'd
Average Biased
25.00
Ps90%/90% (-KTL) Biased
20.00
Ps90%/90% (-KTL) All GND'd
15.00
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.16: Plot of VCONTROL Pin Current (@ ILOAD = 1A) versus Total Dose
The measured values are within datasheet specification maximum limit.
P a g e 36 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.16: Raw data table for VCONTROL Pin Current (@ ILOAD = 1A) versus total dose including
the statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter VC pin I @ VIN=1V, VC=2V, IL =1A
Units
(mA)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiaiton
2
Biased Irradiaiton
3
Biased Irradiaiton
4
Biased Irradiaiton
5
Biased Irradiaiton
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
19.2215
19.3094
18.9853
18.9211
18.7363
19.0927
19.3442
19.1509
19.1861
19.3498
18.9554
18.9751
25
20.2631
20.2326
20.1948
19.3670
19.8601
19.3998
20.5550
20.1643
20.2811
20.4510
19.4195
19.2756
50
19.0080
19.0409
19.0141
18.9774
19.0008
19.2179
19.3972
19.2534
19.0972
19.3437
19.1215
19.1364
75
20.4236
20.1546
20.3125
20.2243
20.0764
20.2840
20.6447
20.8167
20.0337
20.2912
20.7235
19.7775
100
18.7005
18.5874
18.6443
18.6443
18.6457
19.3295
19.0772
18.8537
18.8342
18.8991
19.3246
19.3093
128
19.1486
18.9956
18.9562
18.9930
18.9294
19.2859
19.5055
19.2878
19.1711
19.3813
19.9818
20.0432
150
18.6542
18.3743
18.5168
18.5188
18.4295
18.7962
19.0894
18.8159
18.6591
18.8480
19.4538
19.5400
19.0347 19.9835 19.0082 20.2383 18.6445 19.0046 18.4987
0.2317 0.3808 0.0230 0.1353 0.0400 0.0851 0.1063
19.6700 21.0278 19.0713 20.6093 18.7541 19.2378 18.7901
18.3994 18.9392 18.9452 19.8672 18.5348 18.7713 18.2074
19.2247 20.1702 19.2619 20.4140 18.9987 19.3263 18.8417
0.1165 0.4563 0.1163 0.3131 0.2083 0.1249 0.1561
19.5442 21.4213 19.5809 21.2725 19.5699 19.6686 19.2698
18.9053 18.9191 18.9429 19.5556 18.4275 18.9840 18.4137
35
PASS
PASS
37
PASS
PASS
38
PASS
PASS
40
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 37 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
VC Pin Current (mA) @ VIN = 1V, VC = 2V, IL = 2.8A
100.00
90.00
Specification MAX
Ps90%/90% (+KTL) All GND'd
80.00
Ps90%/90% (+KTL) Biased
70.00
Average All GND'd
60.00
Average Biased
Ps90%/90% (-KTL) Biased
50.00
Ps90%/90% (-KTL) All GND'd
40.00
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.17: Plot of VCONTROL Pin Current (@ ILOAD = 2.8A) versus Total Dose
The measured and computed values are within datasheet specification maximum limit.
P a g e 38 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.17: Raw data table for VCONTROL Pin Current (@ ILOAD = 2.8A) versus total dose including
the statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter VC pin I @ VIN=1V, VC=2V, IL=2.8A
Units
(V)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
45.4104
45.8993
44.9865
44.9341
44.4803
45.2483
45.6495
45.1720
45.4492
45.9047
44.6902
44.8554
25
47.8183
48.0193
48.0407
46.2728
47.0360
46.1250
48.5201
47.5953
47.9006
48.3979
45.9825
45.8579
50
45.0153
45.3731
45.4345
45.4357
45.1632
45.7737
46.0474
45.6617
45.2610
45.8930
45.2723
45.4637
75
48.5840
48.1979
48.7127
48.5917
47.8619
48.3915
49.0504
49.6349
47.5378
48.2962
49.1041
46.8980
100
44.4963
44.5964
44.8165
44.8881
44.6161
45.7036
45.3600
44.9162
44.7974
45.0689
45.6899
45.7811
128
45.7454
45.7890
45.7747
45.9178
45.5028
46.2135
46.5557
46.0817
45.7341
46.3470
47.2534
47.5342
150
44.5628
44.3749
44.7346
44.7823
44.3379
45.0251
45.5340
44.9524
44.5097
45.0943
45.9528
46.2809
45.1421 47.4374 45.2844 48.3896 44.6827 45.7459 44.5585
0.5364 0.7689 0.1873 0.3529 0.1633 0.1511 0.2022
46.6129 49.5459 45.7981 49.3573 45.1306 46.1602 45.1129
43.6714 45.3290 44.7707 47.4220 44.2348 45.3316 44.0041
45.4847 47.7078 45.7274 48.5822 45.1692 46.1864 45.0231
0.2994 0.9606 0.2974 0.7963 0.3655 0.3076 0.3656
46.3057 50.3419 46.5429 50.7655 46.1714 47.0298 46.0256
44.6638 45.0737 44.9118 46.3988 44.1670 45.3430 44.0206
80
PASS
PASS
83
PASS
PASS
85
PASS
PASS
90
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 39 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Current Limit (A) @ VC = VIN = 5V, VOUT = - 0.1V
3.2500
Ps90%/90% (+KTL) All GND'd
3.2000
3.1500
Ps90%/90% (+KTL) Biased
3.1000
Average Biased
3.0500
Average All GND'd
3.0000
2.9500
Ps90%/90% (-KTL) Biased
2.9000
Ps90%/90% (-KTL) All GND'd
2.8500
Specification MIN
2.8000
2.7500
0
25
50
75
100
125
150
175
Total Dose (Krad(Si))
Figure 5.18: Plot of Current Limit versus Total Dose
The measured data are within the datasheet specification minimum limit.
P a g e 40 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table 5.18: Raw data table for Current Limit versus total dose including the statistical
calculations, minimum specification, and the status of the test (PASS/FAIL)
Parameter ILIMIT @ VC=VIN=5V, VOUT = -0.1V
Units
(A)
6
All GND'd Irradiation
7
All GND'd Irradiation
8
All GND'd Irradiation
9
All GND'd Irradiation
10
All GND'd Irradiation
1
Biased Irradiation
2
Biased Irradiation
3
Biased Irradiation
4
Biased Irradiation
5
Biased Irradiation
11
Control Unit
12
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased-Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krad(Si)) @ 10 mrads(Si)/second
0
3.1049
3.0589
3.0358
3.0554
3.0555
3.0768
3.1195
3.1191
3.1169
3.0714
3.0478
3.0263
25
3.1484
3.0990
3.0873
3.0746
3.1576
3.0866
3.1488
3.1429
3.1582
3.1147
3.0610
3.0372
50
3.1285
3.0816
3.0725
3.0840
3.1553
3.1017
3.1306
3.1344
3.1357
3.0990
3.0621
3.0414
75
3.1368
3.0791
3.0767
3.0805
3.1510
3.0932
3.1246
3.1439
3.1183
3.0872
3.0379
3.0111
100
3.1170
3.0656
3.0640
3.0703
3.1427
3.0446
3.1088
3.1158
3.1140
3.0795
3.0455
3.0257
128
3.1508
3.0923
3.0932
3.0986
3.1731
3.1064
3.1351
3.1435
3.1360
3.1078
3.0783
3.0574
150
3.1315
3.0665
3.0793
3.0763
3.1554
3.0817
3.1129
3.1223
3.1097
3.0842
3.0470
3.0290
3.0621
0.0256
3.1322
2.9920
3.1134
0.0373
3.2157
3.0110
3.1044
0.0358
3.2025
3.0063
3.1048
0.0360
3.2036
3.0060
3.0919
0.0359
3.1903
2.9935
3.1216
0.0377
3.2250
3.0182
3.1018
0.0393
3.2094
2.9942
3.1008
0.0244
3.1677
3.0339
2.8
PASS
PASS
3.1302
0.0293
3.2106
3.0499
2.8
PASS
PASS
3.1203
0.0183
3.1705
3.0701
2.8
PASS
PASS
3.1134
0.0233
3.1773
3.0496
3.0925
0.0306
3.1763
3.0087
2.8
PASS
PASS
3.1258
0.0174
3.1734
3.0782
3.1022
0.0182
3.1520
3.0523
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 41 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Appendix A
Picture of one among ten samples used in the test. The part type is in development and
identification number will be marked on top of the future product.
Figure A1: Top View showing serial number
Figure A2: Bottom View
P a g e 42 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Appendix B
Radiation Bias Connection Tables
Table B1: Biased Conditions
PIN
1
2
3
4
FUNCTION
NC
SET
VCONTROL
IN
CASE
OUT
CONNECTION / BIAS
NC
To ground via 10KΩ resistor
To pin 4
To +3V
To ground via 1uF
To pin 3
To ground via 100Ω resistor
To ground via 10uF capacitor
Table B2: All GND’d
PIN
1
2
3
4
CASE
FUNCTION
NC
SET
VCONTROL
IN
OUT
CONNECTION / BIAS
Ground
Ground
Ground
Ground
Ground
P a g e 43 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Figure B1: Total Dose Bias Circuit
Figure B2: Pin-Out
P a g e 44 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Figure B3: Bias Board (top view)
Figure B4: Bias Board (bottom view)
P a g e 45 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Appendix C
P a g e 46 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
P a g e 47 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
P a g e 48 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Appendix D
Table D1: Pre-Irradiation Electrical Characteristics of Device-Under-Test
P a g e 49 | 50
LINEAR TECHNOLOGY CORPORATION
TID LDR RH3083MK HP201494 W2
Table D2: Post-Irradiation Electrical Characteristics of Device-Under-Test
P a g e 50 | 50
LINEAR TECHNOLOGY CORPORATION
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