TID LDR RH3083MK HP201494 W2 Total Ionization Dose (TID) Test Results of the RH3083MK Adjustable 2.8A Single Resistor Low Dropout Regulator @ Low Dose Rate (LDR) LDR = 10 mrads(Si)/s 10 October 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the S-Power Product Engineering and Design groups from Linear Technology for their help with the board design and assembly as well as the data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd from Defense Microelectronics Activity (DMEA) for the extensive work for board setup and continuous dosimetry monitoring throughout the ELDRS tests. P a g e 1 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 TID LDR Testing of the RH3083MK Adjustable 2.8A Single Resistor Low Dropout Regulator Part Type Tested: RH3083MK Adjustable 2.8A Single Resistor Low Dropout Regulator Traceability Information: Fab Lot # HP201494.1; Wafer # 2. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units for unbiased irradiation. Serial numbers 6-10 had all pins tied to ground during irradiation. Serial numbers 1-5 were biased during irradiation. Serial numbers 11 and 12 were used as control. See Appendix B for the radiation bias connection tables. Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test increments: 25 Krads(Si), 50 Krads(Si), 75 Krads(Si), 100 Krads(Si), 128 Krads(Si), 150 Krads(Si). Radiation dose: 10 mrads(Si)/sec. Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D. Test Hardware and Software: LTX pre-irradiation test program EFR3083R.00; LTX postirradiation test program EFR3083R.00. Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD883 and MIL-STD-750. SUMMARY ALL 12 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 1.0 Overview and Background Among other radiation effects, Total Ionizing Dose (TID) may affect circuits’ electrical characteristics, causing parametric and/or functional failures in integrated circuits. During gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge trapping in the transistors’ dielectrics and interface regions, affecting hence the devices’ basic features. Such effects warrant testing and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and process technology. Hence is the requirement per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 to not exceed the allowed time from the end of an incremented irradiation and an electrical test to more than one hour. Additionally, the total time from the end of one incremental irradiation to the start of the next incremental step should be less than two hours. 2.0 Radiation Facility and Test Equipment The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry. 3.0 Test Conditions The 10 samples were placed in a lead/aluminum container and aligned with the radiation source, Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at +3V and other five had all pads grounded. The devices were irradiated up to 150 Krad(Si) with increments of 25, 50, 75, 100, 128 Krads(Si). After each irradiation, the samples were transported in dry ice to Linear Technology testing facility. Testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2 control). The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must pass the datasheet limits. If any of the tested parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted and if valid the lot will be scrapped. P a g e 3 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - SET Pin Current (uA) Output Offset Voltage (mV) Load Regulation ISET (nA) Load Regulation VOS (mV) Line Regulation ISET (nA/V) Line Regulation VOS (mV/V) Minimum Load Current (mA) @ VIN = 1V, VCONTROL = 2V Minimum Load Current (mA) @ VIN = 23V, VCONTROL = 25V VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 0.1A VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 1A VCONTROL Dropout Voltage (V) @ VIN = 1V, ILOAD = 2.8A VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 0.1A VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 1A VIN Dropout Voltage (V) @ VCONTROL = 2V, ILOAD = 2.8A VCONTROL Pin Current (mA) @ VIN = 1V,VCONTROL = 2V, ILOAD = 0.1A VCONTROL Pin Current (mA) @ VIN = 1V,VCONTROL = 2V, ILOAD = 1A VCONTROL Pin Current (mA) @ VIN = 1V,VCONTROL = 2V, ILOAD = 2.8A Current Limit (A) @ VIN = 5V,VCONTROL = 5V, VOUT = -0.1V Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 5.0 Test Results All ten samples passed the post-irradiation electrical tests. All measurements of the 18 listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated by adding to and subtracting from mean the product of standard deviation and the tolerance limit factor KTL where KTL is tabulated from a table of the inverse normal probability distribution. The upper tolerance limit +KTL and the lower tolerance limit -KTL are +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) However, in most cases, mean and standard deviations are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dotted lines with diamond markers are the average of the measured data points of five samples irradiated under electrical bias while the dashed lines with X-markers are the average of measured data points of five units irradiated with all pins tied to ground. The solid lines with triangle markers are the average of the data points after the calculation of the KTL statistics on the sample irradiated in the biased setup. The solid lines with square symbols are the average of the measured points after the application of the KTL statistics on the five samples irradiated with all pins grounded. The orange solid lines with circle markers are the specification limits. The 25 Krads(Si) test limits are using Linear Technology datasheet 20 Krads(Si) specification limits. P a g e 5 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 SET Pin Current (uA) @ VIN =1V, VC =2V, IL=1mA 51.50 Specification MAX 51.00 Ps90%/90% (+KTL) Biased 50.50 Ps90%/90% (+KTL) All GND'd Average Biased 50.00 Average All GND'd Ps90%/90% (-KTL) Biased 49.50 Ps90%/90% (-KTL) All GND'd Specification MIN 49.00 48.50 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.1 Plot of SET Pin Current versus Total Dose The measured data of 10 samples are within datasheet specification limits. Note the preirradiation computed +KTL data point is slightly higher than the maximum limit due to the small 5-piece sample size. P a g e 6 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.1: Raw data for SET Pin current versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) under the orange headers) Parameter ISET @VIN = 1V, VC = 2V, IL = 1mA Units (uA) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 49.7925 50.0863 49.9738 49.9879 50.2430 50.1162 49.9545 50.2078 50.1990 50.3661 50.2360 50.1286 25 49.8481 50.0732 49.9748 49.9607 49.9044 49.9607 49.9731 50.1595 50.2176 50.3846 50.2440 50.0961 50 49.7573 50.0493 49.9524 49.9366 49.8664 49.9736 49.9172 50.1197 50.1778 50.3448 50.2303 50.0897 75 49.8250 50.0640 49.9674 49.9779 49.8619 49.9744 49.9463 50.1466 50.2116 50.3486 50.1062 50.0991 100 49.7384 50.0413 49.9482 49.9449 49.8254 50.2435 49.8941 50.0909 50.2103 50.3382 50.2427 50.0908 128 49.7611 50.0553 49.9414 49.9518 49.8151 49.9688 49.9155 50.1021 50.2325 50.3470 50.2476 50.1035 150 49.7410 50.0384 49.9349 49.9426 49.7692 49.9667 49.8948 50.0914 50.2370 50.3478 50.2517 50.1018 50.0167 49.9522 49.9124 49.9392 49.8996 49.9049 49.8852 0.1651 0.0842 0.1085 0.0960 0.1183 0.1172 0.1260 50.4693 50.1831 50.2099 50.2025 50.2241 50.2262 50.2307 49.5641 49.7214 49.6148 49.6760 49.5752 49.5837 49.5397 50.1687 50.1391 50.1066 50.1255 50.1554 50.1132 50.1075 0.1500 0.1777 0.1699 0.1678 0.1708 0.1796 0.1869 50.5801 50.6262 50.5726 50.5855 50.6237 50.6055 50.6201 49.7573 49.6520 49.6406 49.6655 49.6871 49.6208 49.5949 49.5 49.0 49.0 49.0 PASS PASS PASS PASS PASS PASS PASS PASS 50.5 51.0 51.0 51.0 PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS FAIL PASS PASS PASS PASS PASS PASS P a g e 7 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Output Offset V (mV) @ VIN = 1V, VC =2V,IL=1mA 8.00 Ps90%/90% (+KTL) All GND'd 6.00 Specification MAX 4.00 Ps90%/90% (+KTL) Biased Average All GND'd 2.00 Average Biased 0.00 Ps90%/90% (-KTL) Biased -2.00 Ps90%/90% (-KTL) All GND'd -4.00 Specification MIN -6.00 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.2: Plot of Output Offset Voltage versus Total Dose The measured values of 10 samples are within datasheet specification limits. The +KTL All GND’d computed data points at 128 and 150 Krads(Si) are higher than the maximum specification limit due to the small 5-piece sample size. P a g e 8 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.2: Raw data for output offset voltage versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL under the second orange header) Parameter VOS @ VIN = 1V,VC = 2V,IL = 1mA Units (mV) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 -0.4226 0.0213 0.5932 -0.0423 0.2572 -0.5588 0.6675 0.5152 0.4733 0.6687 -0.2918 -0.2031 25 -0.6016 0.2596 0.5136 0.0260 0.3924 -0.4355 0.5062 0.4830 0.2987 0.3883 -0.2357 -0.0319 50 -0.4595 0.7541 0.6601 0.0239 0.5929 -0.2989 0.7138 0.6552 0.4262 0.5638 -0.2202 -0.0297 75 -0.6154 1.2556 0.5332 -0.1592 0.7016 -0.4318 0.4510 0.4078 0.0939 0.4909 -0.2257 -0.0932 100 -0.3170 2.5209 0.8648 0.0211 1.4121 -0.0097 0.6950 1.0733 0.1298 0.6877 -0.0051 0.0571 128 -0.3944 3.3617 0.8742 -0.1204 1.8887 -0.2064 0.5819 1.2094 -0.1370 0.5575 -0.0709 -0.0144 150 -0.3829 4.5978 0.9982 -0.1446 2.6578 -0.1589 0.5440 1.4539 -0.5235 0.5694 -0.0596 0.0148 0.0814 0.3761 1.1126 -0.9499 0.1180 0.4411 1.3275 -1.0914 0.3143 0.5181 1.7349 -1.1063 0.3432 0.7363 2.3620 -1.6757 0.9004 1.1341 4.0100 -2.2093 1.1220 1.5418 5.3495 -3.1056 1.5453 2.0874 7.2688 -4.1783 0.3532 0.5174 1.7719 -1.0655 -4.0 PASS PASS 4.0 PASS PASS 0.2481 0.3909 1.3200 -0.8238 -4.5 PASS PASS 4.5 PASS PASS 0.4120 0.4120 1.5416 -0.7176 -4.5 PASS PASS 4.5 PASS PASS 0.2024 0.3877 1.2654 -0.8606 0.5152 0.4465 1.7396 -0.7092 -4.5 PASS PASS 4.5 PASS PASS 0.4011 0.5850 2.0052 -1.2031 0.3770 0.7620 2.4664 -1.7125 Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS P a g e 9 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Load Regulation ISET (nA) @ IL = 1 mA to 2.8 A 400 Specification MAX 300 Ps90%/90% (+KTL) All GND'd 200 Ps90%/90% (+KTL) Biased 100 Average All GND'd 0 Average Biased -100 Ps90%/90% (-KTL) Biased -200 Ps90%/90% (-KTL) All GND'd -300 Specification MIN -400 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.3: Plot of Load Regulation ISET versus Total Dose All measured post-irradiation data points are within the datasheet specification limits. P a g e 10 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.3: Raw data for load regulation ISET versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Parameter Load Reg. ISET @IL = 1 mA to 2.8A Units (nA) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 34.9101 50.9754 33.4403 25.0293 36.8164 41.8077 42.1715 40.0760 34.4007 26.0188 46.3187 31.2284 25 49.6075 47.1773 41.0946 33.6149 43.6266 49.9131 56.0249 34.9246 42.4043 33.1784 38.9846 36.5690 50 58.4405 52.0959 46.9590 40.7890 46.7844 48.7053 41.7786 36.2779 58.6006 59.5319 35.0992 34.5171 75 64.7560 63.7519 45.3001 47.9486 52.8671 53.6820 39.6103 53.2164 46.1150 49.1418 36.0305 37.2675 100 44.0778 51.2082 39.0428 40.3088 38.3298 34.8373 43.2046 44.7035 41.1965 41.9532 29.3367 32.1888 128 52.2414 44.0050 37.7768 44.6744 46.0277 40.3525 40.4980 45.8967 44.0341 39.7558 33.2657 28.3326 150 46.1878 50.4660 46.5079 45.9550 53.7111 42.3170 43.4666 50.8735 49.5202 49.0400 31.7668 26.9210 36.2343 43.0242 49.0138 54.9247 42.5935 44.9450 48.5656 9.3908 6.1889 6.6182 8.9458 5.3015 5.1660 3.4202 61.9839 59.9941 67.1608 79.4541 57.1301 59.1102 57.9438 10.4846 26.0543 30.8667 30.3954 28.0568 30.7799 39.1873 36.8949 43.2890 48.9788 48.3531 41.1790 42.1074 47.0434 6.8302 9.7346 10.2125 5.7904 3.7862 2.7051 3.8705 55.6233 69.9814 76.9814 64.2304 51.5609 49.5249 57.6564 18.1665 16.5967 20.9763 32.4758 30.7972 34.6899 36.4305 -200 -300 -300 -300 PASS PASS PASS PASS PASS PASS PASS PASS 200 300 300 300 PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS P a g e 11 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Load Regulation VOS (mV) @ IL = 1 mA to 2.8A 4.0 Specification MAX 3.0 Ps90%/90% (+KTL) All GND'd 2.0 Ps90%/90% (+KTL) Biased 1.0 Average All GND'd 0.0 Average Biased -1.0 Ps90%/90% (-KTL) Biased -2.0 Ps90%/90% (-KTL) All GND'd -3.0 Specification MIN -4.0 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.4: Plot of Load Regulation VOS versus Total Dose All measured post-irradiation data points are within datasheet specification limits. P a g e 12 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.4: Raw data for load regulation VOS versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL). Parameter Load Reg. VOS @IL = 1mA to 2.8A Units (mV) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 -0.0202 -0.0293 -0.0296 0.0379 0.0128 0.0118 -0.0207 -0.0640 -0.0527 -0.0040 0.0018 0.0003 25 0.0094 -0.0118 -0.0148 0.0517 -0.0180 0.0410 0.0147 -0.0378 -0.0166 0.0330 0.0157 0.0135 50 -0.0145 -0.0396 -0.0360 0.0418 -0.0306 0.0386 -0.0253 -0.0668 -0.0573 -0.0190 0.0152 0.0088 75 0.0086 -0.0158 -0.0103 0.0631 -0.0322 0.0489 0.0027 -0.0458 -0.0207 0.0114 0.0435 0.0266 100 -0.1213 -0.1492 -0.1392 -0.0749 -0.1591 -0.0617 -0.1326 -0.1971 -0.1535 -0.1191 -0.0715 -0.0619 128 -0.1220 -0.1315 -0.1428 -0.0682 -0.1442 -0.0785 -0.1206 -0.1837 -0.1436 -0.1192 -0.0626 -0.0427 150 -0.1384 -0.1952 -0.1552 -0.1175 -0.1652 -0.0774 -0.1321 -0.1942 -0.1714 -0.1461 -0.0668 -0.0577 -0.0057 0.0299 0.0764 -0.0877 0.0033 0.0291 0.0831 -0.0765 -0.0158 0.0336 0.0764 -0.1079 0.0027 0.0368 0.1036 -0.0982 -0.1287 0.0332 -0.0377 -0.2198 -0.1218 0.0313 -0.0360 -0.2075 -0.1543 0.0291 -0.0744 -0.2342 -0.0259 0.0320 0.0618 -0.1137 -3.0 PASS PASS 3.0 PASS PASS 0.0068 0.0334 0.0984 -0.0847 -3.5 PASS PASS 3.5 PASS PASS -0.0260 0.0414 0.0877 -0.1396 -3.5 PASS PASS 3.5 PASS PASS -0.0007 0.0355 0.0967 -0.0981 -0.1328 0.0495 0.0030 -0.2685 -3.5 PASS PASS 3.5 PASS PASS -0.1291 0.0385 -0.0236 -0.2346 -0.1442 0.0443 -0.0228 -0.2657 Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS P a g e 13 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Line Regulation ISET (nA/V) @ VC = 2V to 25V 15.00 Specification MAX 10.00 Ps90%/90% (+KTL) All GND'd 5.00 Ps90%/90% (+KTL) Biased Average All GND'd 0.00 Average Biased Ps90%/90% (-KTL) Biased -5.00 Ps90%/90% (-KTL) All GND'd Specification MIN -10.00 -15.00 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.5: Plot of Line Regulation ISET versus Total Dose The measured parameters are over the specification minimum limits. P a g e 14 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.5: Raw data for line regulation ISET versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Parameter Line Reg. ISET @ VC = 2V to 25V Units (nA/V) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.6118 1.1477 1.7595 1.7608 1.3008 1.6070 1.2249 1.5305 1.7601 1.8373 1.6070 1.4546 25 1.1490 1.4539 1.7601 1.1477 1.4539 0.5353 1.6836 1.8373 1.3774 1.3780 1.5311 1.2243 50 1.3014 1.6836 1.8367 1.8361 1.3014 1.6083 1.5975 1.7595 1.2249 1.2249 1.6741 2.0664 75 1.1471 1.1458 1.2989 1.2224 1.0692 1.2217 1.5280 1.0686 1.5280 1.2217 1.6804 1.7564 100 0.7023 0.4808 0.6896 0.5473 0.7523 1.1116 0.5802 0.5327 0.7845 0.7308 1.0863 0.9604 128 0.7206 0.4606 0.6801 0.6131 0.6390 0.5239 0.5909 0.4872 0.7864 0.5625 0.8257 0.9092 150 0.7301 0.6441 0.8541 0.6276 0.8244 0.6257 0.8605 0.6523 0.9661 0.9440 1.3653 1.1534 1.3161 0.4793 2.6304 0.0018 1.3929 0.2559 2.0946 0.6913 1.5919 0.2723 2.3386 0.8451 1.1767 0.0872 1.4157 0.9376 0.6345 0.1148 0.9493 0.3197 0.6227 0.0994 0.8953 0.3501 0.7361 0.1025 1.0170 0.4551 1.5920 0.2384 2.2455 0.9384 -8 PASS PASS 8 PASS PASS 1.3623 0.5033 2.7424 -0.0178 -10 PASS PASS 10 PASS PASS 1.4830 0.2442 2.1526 0.8135 -10 PASS PASS 10 PASS PASS 1.3136 0.2054 1.8769 0.7503 0.7480 0.2282 1.3738 0.1221 -10 PASS PASS 10 PASS PASS 0.5902 0.1165 0.9096 0.2707 0.8097 0.1610 1.2512 0.3682 Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS P a g e 15 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Line Regulation VOS (mV/V) @ VC = 2V to 25V 0.040 Specification MAX 0.030 Ps90%/90% (+KTL) Biased 0.020 Ps90%/90% (+KTL) All GND'd 0.010 Average Biased 0.000 Average All GND'd -0.010 Ps90%/90% (-KTL) All GND'd -0.020 Ps90%/90% (-KTL) Biased -0.030 Specification MIN -0.040 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.6: Plot of Line Regulation VOS versus Total Dose The data of five samples are within the datasheet specification limits. P a g e 16 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.6: Raw data for line regulation VOS versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) Parameter Line Reg. VOS @ VC = 2V to 25V Units (mV/V) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.0054 0.0058 0.0058 0.0057 0.0065 0.0065 0.0056 0.0049 0.0065 0.0053 0.0065 0.0064 25 0.0062 0.0076 0.0073 0.0072 0.0063 0.0075 0.0066 0.0069 0.0075 0.0067 0.0066 0.0062 50 0.0066 0.0077 0.0077 0.0068 0.0070 0.0079 0.0072 0.0089 0.0081 0.0078 0.0068 0.0060 75 0.0077 0.0091 0.0088 0.0073 0.0074 0.0092 0.0074 0.0113 0.0086 0.0073 0.0063 0.0062 100 0.0047 0.0073 0.0063 0.0027 0.0045 0.0035 0.0031 0.0118 0.0053 0.0037 0.0038 0.0029 128 0.0058 0.0077 0.0081 0.0017 0.0056 0.0078 0.0025 0.0139 0.0067 0.0033 0.0043 0.0030 150 0.0047 0.0100 0.0091 0.0006 0.0053 0.0072 0.0015 0.0159 0.0068 0.0033 0.0040 0.0036 0.0059 0.0004 0.0070 0.0047 0.0069 0.0006 0.0086 0.0053 0.0072 0.0005 0.0086 0.0057 0.0081 0.0008 0.0104 0.0058 0.0051 0.0018 0.0100 0.0003 0.0058 0.0025 0.0128 -0.0012 0.0059 0.0038 0.0163 -0.0044 0.0057 0.0007 0.0077 0.0038 -0.020 PASS PASS 0.020 PASS PASS 0.0071 0.0004 0.0082 0.0059 -0.025 PASS PASS 0.025 PASS PASS 0.0080 0.0006 0.0097 0.0062 -0.025 PASS PASS 0.025 PASS PASS 0.0088 0.0016 0.0132 0.0043 0.0055 0.0036 0.0154 -0.0045 -0.030 PASS PASS 0.030 PASS PASS 0.0068 0.0045 0.0192 -0.0056 0.0069 0.0055 0.0221 -0.0082 Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS P a g e 17 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Minimum IL (mA) @ VIN=1V, VC=2V 0.55 0.50 Specification MAX Ps90%/90% (+KTL) All GND'd 0.45 Ps90%/90% (+KTL) Biased 0.40 Average All GND'd Average Biased 0.35 Ps90%/90% (-KTL) All GND'd 0.30 Ps90%/90% (-KTL) Biased 0.25 0.20 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.7: Plot of Minimum Load Current IL (@ VCONTROL = 2V) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 18 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.7: Raw data table for minimum load current (at VCONTROL = 2V) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 6 7 8 9 10 1 2 3 4 5 11 12 Min IL @ VIN=1V,VC=2V (mA) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.3966 0.3906 0.4014 0.3912 0.4014 0.3823 0.3912 0.4055 0.4055 0.3775 0.3745 0.3823 25 0.3600 0.3988 0.3701 0.3606 0.3820 0.3820 0.3659 0.3898 0.3988 0.3970 0.3850 0.3803 50 0.3839 0.3839 0.3785 0.3940 0.3911 0.3761 0.3976 0.3785 0.3976 0.3976 0.3696 0.3887 75 0.3368 0.3440 0.3422 0.3493 0.3249 0.3249 0.3279 0.3207 0.3333 0.3344 0.3660 0.3607 100 0.3292 0.3276 0.3324 0.3279 0.3311 0.3418 0.3260 0.3170 0.3308 0.3287 0.3416 0.3419 128 0.3281 0.3242 0.3324 0.3239 0.3293 0.3240 0.3227 0.3124 0.3260 0.3250 0.3419 0.3416 150 0.3247 0.3199 0.3313 0.3191 0.3260 0.3191 0.3186 0.3049 0.3237 0.3198 0.3418 0.3418 0.3962 0.0052 0.4106 0.3819 0.3743 0.0163 0.4191 0.3295 0.3863 0.0062 0.4033 0.3692 0.3394 0.0093 0.3649 0.3140 0.3296 0.0021 0.3353 0.3239 0.3276 0.0036 0.3375 0.3177 0.3242 0.0050 0.3378 0.3106 0.3924 0.0130 0.4280 0.3569 0.3867 0.0134 0.4233 0.3501 0.3895 0.0111 0.4201 0.3590 0.3283 0.0057 0.3440 0.3125 0.3289 0.0090 0.3535 0.3043 0.3220 0.0055 0.3371 0.3069 0.3173 0.0072 0.3369 0.2976 0.5 PASS PASS 0.5 PASS PASS 0.5 PASS PASS 0.5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 19 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Minimum IL (mA) @ VIN=23V, VC=25V, VOUT=0.1V 1.10 Specification MAX 1.00 Ps90%/90% (+KTL) All GND'd 0.90 Ps90%/90% (+KTL) Biased 0.80 Average All GND'd 0.70 Average Biased 0.60 Ps90%/90% (-KTL) All GND'd 0.50 Ps90%/90% (-KTL) Biased 0.40 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.8: Plot of Minimum Load Current IL (@ VCONTROL = 25V) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 20 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.8: Raw data table for minimum load current (at VCONTROL = 25V) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Min IL @VIN=23V,VC=25V,VOUT =.1V Units (mA) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.5540 0.5820 0.5916 0.5802 0.5772 0.5874 0.5642 0.5707 0.5963 0.5874 0.5683 0.5749 25 0.5604 0.5783 0.5616 0.5633 0.5717 0.5759 0.5538 0.5896 0.5842 0.5878 0.5783 0.5896 50 0.5550 0.5746 0.5841 0.5692 0.5841 0.5794 0.5746 0.5603 0.5931 0.5746 0.5626 0.5925 75 0.5209 0.5346 0.5382 0.5305 0.5209 0.5221 0.5346 0.5090 0.5221 0.5495 0.5209 0.5328 100 0.5287 0.5391 0.5448 0.5322 0.5394 0.5355 0.5278 0.5215 0.5347 0.5412 0.5349 0.5353 128 0.5265 0.5375 0.5447 0.5288 0.5382 0.5254 0.5255 0.5156 0.5327 0.5367 0.5343 0.5323 150 0.5280 0.5380 0.5468 0.5268 0.5401 0.5251 0.5235 0.5119 0.5332 0.5365 0.5346 0.5340 0.5770 0.0139 0.6152 0.5388 0.5670 0.0077 0.5881 0.5460 0.5734 0.0121 0.6067 0.5401 0.5290 0.0079 0.5507 0.5074 0.5368 0.0064 0.5543 0.5193 0.5351 0.0074 0.5555 0.5148 0.5359 0.0085 0.5592 0.5127 0.5812 0.0133 0.6177 0.5448 0.5783 0.0147 0.6185 0.5381 0.5764 0.0118 0.6086 0.5441 0.5275 0.0153 0.5694 0.4855 0.5321 0.0076 0.5531 0.5112 0.5272 0.0081 0.5493 0.5051 0.5260 0.0096 0.5523 0.4998 1 PASS PASS 1 PASS PASS 1 PASS PASS 1 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 21 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VC Dropout Voltage (V) @ VIN=1V, IL=0.1A 1.45 Specification MAX Ps90%/90% (+KTL) All GND'd 1.40 Ps90%/90% (+KTL) Biased Average All GND'd 1.35 Average Biased 1.30 Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) All GND'd 1.25 1.20 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.9: Plot of VCONTROL Dropout Voltage (@ ILOAD = 0.1A) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 22 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.9: Raw data table for VCONTROL Dropout Voltage (@ ILOAD = 0.1A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter VC Dropout @ VIN = 1V,IL = 0.1A Units (V) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiaiton 2 Biased Irradiaiton 3 Biased Irradiaiton 4 Biased Irradiaiton 5 Biased Irradiaiton 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 1.2467 1.2313 1.2342 1.2480 1.2389 1.2491 1.2472 1.2485 1.2489 1.2450 1.2340 1.2355 25 1.2862 1.2694 1.2729 1.2661 1.2721 1.2617 1.2836 1.2826 1.2866 1.2829 1.2387 1.2362 50 1.2611 1.2509 1.2537 1.2646 1.2618 1.2626 1.2617 1.2656 1.2634 1.2630 1.2331 1.2327 75 1.3057 1.2878 1.2939 1.3043 1.2963 1.2936 1.2964 1.3089 1.2900 1.2905 1.2704 1.2477 100 1.2712 1.2624 1.2639 1.2746 1.2743 1.2370 1.2667 1.2673 1.2675 1.2636 1.2369 1.2379 128 1.2886 1.2820 1.2794 1.2902 1.2913 1.2782 1.2807 1.2804 1.2786 1.2784 1.2509 1.2523 150 1.2878 1.2790 1.2807 1.2903 1.2940 1.2729 1.2779 1.2770 1.2743 1.2726 1.2409 1.2442 1.2398 0.0074 1.2601 1.2196 1.2733 0.0077 1.2943 1.2524 1.2584 0.0058 1.2744 1.2425 1.2976 0.0074 1.3180 1.2772 1.2693 0.0058 1.2851 1.2534 1.2863 0.0053 1.3007 1.2718 1.2863 0.0064 1.3038 1.2689 1.2477 0.0017 1.2524 1.2431 1.2795 0.0101 1.3071 1.2519 1.2632 0.0015 1.2672 1.2593 1.2959 0.0077 1.3170 1.2747 1.2604 0.0132 1.2966 1.2242 1.2793 0.0012 1.2826 1.2759 1.2749 0.0024 1.2816 1.2683 1.40 PASS PASS 1.41 PASS PASS 1.42 PASS PASS 1.43 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 23 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 1.50 VC Dropout Voltage (V) @ VIN =1V,IL =1A Specification MAX 1.45 Ps90%/90% (+KTL) All GND'd 1.40 Ps90%/90% (+KTL) Biased 1.35 Average All GND'd Average Biased 1.30 Ps90%/90% (-KTL) All GND'd 1.25 Ps90%/90% (-KTL) Biased 1.20 1.15 1.10 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.10: Plot of VCONTROL Dropout Voltage (@ ILOAD = 1A) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 24 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.10: Raw data table for VCONTROL Dropout Voltage (@ ILOAD = 1A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 6 7 8 9 10 1 2 3 4 5 11 12 Dropout VC @ VIN = 1V,IL = 1A (V) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 1.2483 1.2334 1.2362 1.2483 1.2404 1.2512 1.2480 1.2499 1.2503 1.2471 1.2347 1.2364 25 1.2880 1.2716 1.2749 1.2671 1.2742 1.2638 1.2856 1.2833 1.2887 1.2850 1.2402 1.2365 50 1.2636 1.2537 1.2565 1.2673 1.2576 1.2654 1.2646 1.2672 1.2648 1.2655 1.2334 1.2349 75 1.3077 1.2902 1.2963 1.3067 1.2986 1.2957 1.2988 1.3117 1.2924 1.2920 1.2720 1.2481 100 1.2735 1.2648 1.2667 1.2772 1.2771 1.2391 1.2695 1.2707 1.2706 1.2670 1.2390 1.2387 128 1.2912 1.2836 1.2808 1.2917 1.2926 1.2799 1.2837 1.2838 1.2814 1.2804 1.2519 1.2547 150 1.2904 1.2820 1.2836 1.2934 1.2968 1.2762 1.2813 1.2807 1.2774 1.2760 1.2413 1.2444 1.2413 0.0068 1.2601 1.2225 1.2752 0.0078 1.2966 1.2538 1.2598 0.0056 1.2750 1.2445 1.2999 0.0073 1.3200 1.2798 1.2719 0.0058 1.2878 1.2559 1.2880 0.0054 1.3027 1.2733 1.2892 0.0063 1.3066 1.2719 1.2493 0.0017 1.2539 1.2447 1.2813 0.0100 1.3086 1.2540 1.2655 0.0010 1.2684 1.2626 1.2981 0.0081 1.3202 1.2760 1.2634 0.0137 1.3008 1.2259 1.2818 0.0018 1.2868 1.2768 1.2783 0.0025 1.2853 1.2714 1.45 PASS PASS 1.46 PASS PASS 1.47 PASS PASS 1.48 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 25 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 1.55 VC Dropout Voltage (V) @ VIN =1V, IL = 2.8A Specification MAX 1.50 Ps90%/90% (+KTL) All GND'd 1.45 Ps90%/90% (+KTL) Biased 1.40 Average All GND'd 1.35 Average Biased Ps90%/90% (-KTL) All GND'd 1.30 Ps90%/90% (-KTL) Biased 1.25 1.20 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.11: Plot of VCONTROL Dropout Voltage (@ ILOAD = 2.8A) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 26 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.11: Raw data table for VCONTROL Dropout Voltage (@ ILOAD = 2.8A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 6 7 8 9 10 1 2 3 4 5 11 12 VC Dropout @ VIN=1V,IL=2.8A (V) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 1.2590 1.2509 1.2577 1.2649 1.2540 1.2606 1.2596 1.2596 1.2591 1.2566 1.2588 1.2575 25 1.2975 1.2824 1.2855 1.2783 1.2824 1.2740 1.2967 1.2935 1.2962 1.2925 1.2604 1.2544 50 1.2724 1.2645 1.2666 1.2781 1.2716 1.2758 1.2768 1.2788 1.2748 1.2746 1.2532 1.2504 75 1.3172 1.3008 1.3060 1.3168 1.3066 1.3049 1.3099 1.3221 1.3012 1.3030 1.2822 1.2624 100 1.2838 1.2771 1.2781 1.2869 1.2857 1.2552 1.2828 1.2833 1.2802 1.2770 1.2550 1.2521 128 1.3013 1.2957 1.2934 1.3029 1.3026 1.2905 1.2974 1.2983 1.2927 1.2920 1.2709 1.2692 150 1.3007 1.2946 1.2950 1.3038 1.3055 1.2872 1.2964 1.2965 1.2894 1.2885 1.2567 1.2558 1.2573 0.0053 1.2718 1.2428 1.2852 0.0073 1.3054 1.2651 1.2707 0.0053 1.2853 1.2560 1.3095 0.0072 1.3293 1.2897 1.2823 0.0045 1.2946 1.2701 1.2992 0.0043 1.3110 1.2873 1.2999 0.0050 1.3136 1.2862 1.2591 0.0015 1.2632 1.2550 1.2906 0.0094 1.3165 1.2647 1.2761 0.0017 1.2809 1.2714 1.3082 0.0084 1.3313 1.2851 1.2757 0.0117 1.3079 1.2435 1.2942 0.0035 1.3037 1.2847 1.2916 0.0045 1.3039 1.2792 1.50 PASS PASS 1.51 PASS PASS 1.52 PASS PASS 1.53 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 27 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VIN Dropout Voltage (V) @ VC = 2V, IL = 0.1A 0.050 0.045 Specification MAX 0.040 Ps90%/90% (+KTL) Biased 0.035 Ps90%/90% (+KTL) All GND'd 0.030 Average Biased 0.025 Average All GND'd 0.020 Ps90%/90% (-KTL) All GND'd 0.015 Ps90%/90% (-KTL) Biased 0.010 0.005 0.000 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.12: Plot of VIN Dropout Voltage (@ ILOAD = 0.1A) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 28 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.12: Raw data table for VIN Dropout Voltage (@ ILOAD = 0.1A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter VIN Dropout @ VC = 2V,IL = 0.1A Units (V) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiaiton 2 Biased Irradiaiton 3 Biased Irradiaiton 4 Biased Irradiaiton 5 Biased Irradiaiton 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.0168 0.0165 0.0167 0.0174 0.0173 0.0173 0.0168 0.0167 0.0168 0.0168 0.0162 0.0168 25 0.0188 0.0185 0.0187 0.0189 0.0186 0.0188 0.0189 0.0189 0.0188 0.0189 0.0165 0.0169 50 0.0184 0.0186 0.0187 0.0193 0.0193 0.0194 0.0190 0.0197 0.0188 0.0192 0.0161 0.0166 75 0.0203 0.0203 0.0204 0.0210 0.0206 0.0210 0.0209 0.0221 0.0203 0.0207 0.0179 0.0173 100 0.0197 0.0205 0.0200 0.0208 0.0205 0.0162 0.0208 0.0221 0.0203 0.0219 0.0163 0.0167 128 0.0209 0.0220 0.0211 0.0220 0.0218 0.0220 0.0220 0.0238 0.0214 0.0219 0.0167 0.0173 150 0.0209 0.0226 0.0211 0.0222 0.0223 0.0221 0.0222 0.0243 0.0215 0.0221 0.0160 0.0166 0.0169 0.0004 0.0180 0.0159 0.0187 0.0002 0.0191 0.0182 0.0189 0.0004 0.0200 0.0178 0.0205 0.0003 0.0214 0.0197 0.0203 0.0004 0.0215 0.0191 0.0216 0.0005 0.0230 0.0201 0.0218 0.0007 0.0239 0.0198 0.0169 0.0002 0.0175 0.0162 0.0189 0.0001 0.0190 0.0187 0.0192 0.0003 0.0201 0.0183 0.0210 0.0007 0.0228 0.0192 0.0203 0.0024 0.0269 0.0136 0.0222 0.0009 0.0247 0.0197 0.0224 0.0011 0.0254 0.0195 0.035 PASS PASS 0.040 PASS PASS 0.040 PASS PASS 0.045 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 29 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VIN Dropout Voltage (V) @ VC = 2V, IL = 1A 0.240 Specification MAX 0.220 Ps90%/90% (+KTL) All GND'd 0.200 Ps90%/90% (+KTL) Biased Average All GND'd 0.180 Average Biased 0.160 Ps90%/90% (-KTL) Biased 0.140 Ps90%/90% (-KTL) All GND'd 0.120 0.100 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.13: Plot of VIN Dropout Voltage (@ ILOAD = 1A) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 30 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.13: Raw data table for VIN Dropout Voltage (@ ILOAD = 1A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 6 7 8 9 10 1 2 3 4 5 11 12 VIN Dropout @VC = 2V,IL = 1A (V) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.1414 0.1403 0.1448 0.1459 0.1425 0.1441 0.1421 0.1426 0.1419 0.1439 0.1400 0.1429 25 0.1393 0.1384 0.1433 0.1470 0.1435 0.1460 0.1406 0.1424 0.1397 0.1414 0.1396 0.1436 50 0.1437 0.1428 0.1476 0.1488 0.1472 0.1472 0.1449 0.1466 0.1440 0.1456 0.1395 0.1431 75 0.1401 0.1406 0.1443 0.1459 0.1446 0.1451 0.1422 0.1432 0.1425 0.1439 0.1393 0.1418 100 0.1457 0.1462 0.1500 0.1511 0.1495 0.1385 0.1476 0.1507 0.1464 0.1486 0.1385 0.1422 128 0.1461 0.1473 0.1507 0.1520 0.1508 0.1506 0.1484 0.1519 0.1474 0.1491 0.1378 0.1411 150 0.1467 0.1493 0.1511 0.1529 0.1520 0.1512 0.1488 0.1531 0.1481 0.1499 0.1378 0.1411 0.1430 0.0023 0.1494 0.1366 0.1423 0.0035 0.1519 0.1327 0.1460 0.0026 0.1532 0.1389 0.1431 0.0026 0.1502 0.1360 0.1485 0.0024 0.1551 0.1419 0.1494 0.0026 0.1564 0.1424 0.1504 0.0024 0.1571 0.1437 0.1429 0.0010 0.1457 0.1401 0.1420 0.0025 0.1487 0.1353 0.1456 0.0013 0.1492 0.1421 0.1434 0.0012 0.1466 0.1402 0.1464 0.0047 0.1592 0.1336 0.1495 0.0018 0.1543 0.1446 0.1502 0.0020 0.1556 0.1448 0.220 PASS PASS 0.225 PASS PASS 0.225 PASS PASS 0.225 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 31 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VIN Dropout Voltage (V) @ VC = 2V, IL = 2.8A 0.700 Specification MAX 0.650 Ps90%/90% (+KTL) All GND'd 0.600 Ps90%/90% (+KTL) Biased 0.550 Average All GND'd Average Biased 0.500 Ps90%/90% (-KTL) Biased 0.450 Ps90%/90% (-KTL) All GND'd 0.400 0.350 0.300 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.14: Plot of VIN Dropout Voltage (@ ILOAD = 2.8A) versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 32 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.14: Raw data table for VIN Dropout Voltage (@ ILOAD = 2.8A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 6 7 8 9 10 1 2 3 4 5 11 12 VIN Dropout @VC = 2V,IL = 2.8A (V) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Biased Irradiaiton Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 0.4352 0.4313 0.4552 0.4545 0.4379 0.4450 0.4384 0.4429 0.4365 0.4451 0.4322 0.4443 25 0.4208 0.4175 0.4424 0.4527 0.4395 0.4464 0.4250 0.4335 0.4210 0.4286 0.4299 0.4460 50 0.4352 0.4304 0.4553 0.4550 0.4489 0.4466 0.4382 0.4440 0.4346 0.4407 0.4294 0.4433 75 0.4173 0.4172 0.4383 0.4389 0.4350 0.4349 0.4232 0.4248 0.4244 0.4300 0.4257 0.4376 100 0.4380 0.4353 0.4591 0.4587 0.4520 0.4259 0.4417 0.4502 0.4381 0.4465 0.4261 0.4404 128 0.4367 0.4356 0.4594 0.4592 0.4532 0.4519 0.4417 0.4504 0.4390 0.4454 0.4228 0.4359 150 0.4371 0.4385 0.4585 0.4592 0.4540 0.4514 0.4409 0.4512 0.4392 0.4461 0.4238 0.4363 0.4428 0.0112 0.4736 0.4121 0.4346 0.0150 0.4756 0.3936 0.4450 0.0115 0.4766 0.4134 0.4293 0.0111 0.4599 0.3988 0.4486 0.0113 0.4797 0.4176 0.4488 0.0118 0.4813 0.4164 0.4495 0.0109 0.4792 0.4197 0.4416 0.0039 0.4524 0.4308 0.4309 0.0098 0.4578 0.4040 0.4408 0.0047 0.4538 0.4278 0.4275 0.0049 0.4409 0.4141 0.4405 0.0093 0.4661 0.4149 0.4457 0.0055 0.4607 0.4306 0.4458 0.0057 0.4613 0.4302 0.650 PASS PASS 0.655 PASS PASS 0.655 PASS PASS 0.660 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 33 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VC Pin Current (mA) @ VIN = 1V, VC = 2V, IL =.1A 11.00 Specification MAX 10.00 Ps90%/90% (+KTL) Biased 9.00 Average Biased Ps90%/90% (+KTL) All GND'd 8.00 Average All GND'd 7.00 Ps90%/90% (-KTL) Biased 6.00 Ps90%/90% (-KTL) All GND'd 5.00 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.15: Plot of VCONTROL Pin Current (@ ILOAD = 0.1A) versus Total Dose The measured data points are within the datasheet specification maximum limit. P a g e 34 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.15: Raw data table for VCONTROL Pin Current (@ ILOAD = 0.1A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter VC pin I @ VIN=1V, VC=2V, IL=0.1A Units (mA) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiaiton 2 Biased Irradiaiton 3 Biased Irradiaiton 4 Biased Irradiaiton 5 Biased Irradiaiton 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 5.9877 5.9864 5.8927 5.8652 5.8025 5.9128 6.0019 5.9809 5.9721 5.9950 5.8851 5.8904 25 5.9528 5.9374 5.9308 5.8858 5.9286 5.9140 6.0251 5.9931 5.9506 5.9815 5.9784 5.9762 50 5.8754 5.8352 5.8338 5.8238 5.8464 5.8827 5.9560 5.9243 5.8901 5.9044 5.9683 5.9754 75 5.8910 5.8456 5.8550 5.8304 5.8456 5.8962 5.9829 5.9493 5.8987 5.9223 6.0427 6.0138 100 5.7781 5.7085 5.7286 5.7258 5.7359 6.0032 5.8739 5.8367 5.8253 5.8207 6.0003 5.9984 128 5.7517 5.6699 5.6858 5.6827 5.6836 5.7932 5.8535 5.8118 5.8039 5.8051 6.0214 6.0214 150 5.6875 5.5925 5.6205 5.6187 5.6129 5.7538 5.8144 5.7647 5.7618 5.7575 6.0102 6.0138 5.9069 0.0801 6.1266 5.6872 5.9271 0.0249 5.9955 5.8587 5.8429 0.0199 5.8974 5.7885 5.8535 0.0227 5.9159 5.7912 5.7354 0.0259 5.8065 5.6643 5.6948 0.0324 5.7837 5.6058 5.6264 0.0359 5.7249 5.5279 5.9725 0.0354 6.0695 5.8756 5.9729 0.0423 6.0889 5.8568 5.9115 0.0295 5.9924 5.8306 5.9299 0.0366 6.0302 5.8296 5.8720 0.0763 6.0812 5.6628 5.8135 0.0233 5.8775 5.7496 5.7705 0.0249 5.8388 5.7021 10.0 PASS PASS 10.1 PASS PASS 10.2 PASS PASS 10.5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 35 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VC Pin Current (mA)@ VIN = 1V, VC = 2V, IL = 1A 45.00 Specification MAX 40.00 Ps90%/90% (+KTL) Biased 35.00 Ps90%/90% (+KTL) All GND'd 30.00 Average All GND'd Average Biased 25.00 Ps90%/90% (-KTL) Biased 20.00 Ps90%/90% (-KTL) All GND'd 15.00 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.16: Plot of VCONTROL Pin Current (@ ILOAD = 1A) versus Total Dose The measured values are within datasheet specification maximum limit. P a g e 36 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.16: Raw data table for VCONTROL Pin Current (@ ILOAD = 1A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter VC pin I @ VIN=1V, VC=2V, IL =1A Units (mA) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiaiton 2 Biased Irradiaiton 3 Biased Irradiaiton 4 Biased Irradiaiton 5 Biased Irradiaiton 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 19.2215 19.3094 18.9853 18.9211 18.7363 19.0927 19.3442 19.1509 19.1861 19.3498 18.9554 18.9751 25 20.2631 20.2326 20.1948 19.3670 19.8601 19.3998 20.5550 20.1643 20.2811 20.4510 19.4195 19.2756 50 19.0080 19.0409 19.0141 18.9774 19.0008 19.2179 19.3972 19.2534 19.0972 19.3437 19.1215 19.1364 75 20.4236 20.1546 20.3125 20.2243 20.0764 20.2840 20.6447 20.8167 20.0337 20.2912 20.7235 19.7775 100 18.7005 18.5874 18.6443 18.6443 18.6457 19.3295 19.0772 18.8537 18.8342 18.8991 19.3246 19.3093 128 19.1486 18.9956 18.9562 18.9930 18.9294 19.2859 19.5055 19.2878 19.1711 19.3813 19.9818 20.0432 150 18.6542 18.3743 18.5168 18.5188 18.4295 18.7962 19.0894 18.8159 18.6591 18.8480 19.4538 19.5400 19.0347 19.9835 19.0082 20.2383 18.6445 19.0046 18.4987 0.2317 0.3808 0.0230 0.1353 0.0400 0.0851 0.1063 19.6700 21.0278 19.0713 20.6093 18.7541 19.2378 18.7901 18.3994 18.9392 18.9452 19.8672 18.5348 18.7713 18.2074 19.2247 20.1702 19.2619 20.4140 18.9987 19.3263 18.8417 0.1165 0.4563 0.1163 0.3131 0.2083 0.1249 0.1561 19.5442 21.4213 19.5809 21.2725 19.5699 19.6686 19.2698 18.9053 18.9191 18.9429 19.5556 18.4275 18.9840 18.4137 35 PASS PASS 37 PASS PASS 38 PASS PASS 40 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 37 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 VC Pin Current (mA) @ VIN = 1V, VC = 2V, IL = 2.8A 100.00 90.00 Specification MAX Ps90%/90% (+KTL) All GND'd 80.00 Ps90%/90% (+KTL) Biased 70.00 Average All GND'd 60.00 Average Biased Ps90%/90% (-KTL) Biased 50.00 Ps90%/90% (-KTL) All GND'd 40.00 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.17: Plot of VCONTROL Pin Current (@ ILOAD = 2.8A) versus Total Dose The measured and computed values are within datasheet specification maximum limit. P a g e 38 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.17: Raw data table for VCONTROL Pin Current (@ ILOAD = 2.8A) versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter VC pin I @ VIN=1V, VC=2V, IL=2.8A Units (V) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 45.4104 45.8993 44.9865 44.9341 44.4803 45.2483 45.6495 45.1720 45.4492 45.9047 44.6902 44.8554 25 47.8183 48.0193 48.0407 46.2728 47.0360 46.1250 48.5201 47.5953 47.9006 48.3979 45.9825 45.8579 50 45.0153 45.3731 45.4345 45.4357 45.1632 45.7737 46.0474 45.6617 45.2610 45.8930 45.2723 45.4637 75 48.5840 48.1979 48.7127 48.5917 47.8619 48.3915 49.0504 49.6349 47.5378 48.2962 49.1041 46.8980 100 44.4963 44.5964 44.8165 44.8881 44.6161 45.7036 45.3600 44.9162 44.7974 45.0689 45.6899 45.7811 128 45.7454 45.7890 45.7747 45.9178 45.5028 46.2135 46.5557 46.0817 45.7341 46.3470 47.2534 47.5342 150 44.5628 44.3749 44.7346 44.7823 44.3379 45.0251 45.5340 44.9524 44.5097 45.0943 45.9528 46.2809 45.1421 47.4374 45.2844 48.3896 44.6827 45.7459 44.5585 0.5364 0.7689 0.1873 0.3529 0.1633 0.1511 0.2022 46.6129 49.5459 45.7981 49.3573 45.1306 46.1602 45.1129 43.6714 45.3290 44.7707 47.4220 44.2348 45.3316 44.0041 45.4847 47.7078 45.7274 48.5822 45.1692 46.1864 45.0231 0.2994 0.9606 0.2974 0.7963 0.3655 0.3076 0.3656 46.3057 50.3419 46.5429 50.7655 46.1714 47.0298 46.0256 44.6638 45.0737 44.9118 46.3988 44.1670 45.3430 44.0206 80 PASS PASS 83 PASS PASS 85 PASS PASS 90 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 39 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Current Limit (A) @ VC = VIN = 5V, VOUT = - 0.1V 3.2500 Ps90%/90% (+KTL) All GND'd 3.2000 3.1500 Ps90%/90% (+KTL) Biased 3.1000 Average Biased 3.0500 Average All GND'd 3.0000 2.9500 Ps90%/90% (-KTL) Biased 2.9000 Ps90%/90% (-KTL) All GND'd 2.8500 Specification MIN 2.8000 2.7500 0 25 50 75 100 125 150 175 Total Dose (Krad(Si)) Figure 5.18: Plot of Current Limit versus Total Dose The measured data are within the datasheet specification minimum limit. P a g e 40 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table 5.18: Raw data table for Current Limit versus total dose including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL) Parameter ILIMIT @ VC=VIN=5V, VOUT = -0.1V Units (A) 6 All GND'd Irradiation 7 All GND'd Irradiation 8 All GND'd Irradiation 9 All GND'd Irradiation 10 All GND'd Irradiation 1 Biased Irradiation 2 Biased Irradiation 3 Biased Irradiation 4 Biased Irradiation 5 Biased Irradiation 11 Control Unit 12 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased-Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krad(Si)) @ 10 mrads(Si)/second 0 3.1049 3.0589 3.0358 3.0554 3.0555 3.0768 3.1195 3.1191 3.1169 3.0714 3.0478 3.0263 25 3.1484 3.0990 3.0873 3.0746 3.1576 3.0866 3.1488 3.1429 3.1582 3.1147 3.0610 3.0372 50 3.1285 3.0816 3.0725 3.0840 3.1553 3.1017 3.1306 3.1344 3.1357 3.0990 3.0621 3.0414 75 3.1368 3.0791 3.0767 3.0805 3.1510 3.0932 3.1246 3.1439 3.1183 3.0872 3.0379 3.0111 100 3.1170 3.0656 3.0640 3.0703 3.1427 3.0446 3.1088 3.1158 3.1140 3.0795 3.0455 3.0257 128 3.1508 3.0923 3.0932 3.0986 3.1731 3.1064 3.1351 3.1435 3.1360 3.1078 3.0783 3.0574 150 3.1315 3.0665 3.0793 3.0763 3.1554 3.0817 3.1129 3.1223 3.1097 3.0842 3.0470 3.0290 3.0621 0.0256 3.1322 2.9920 3.1134 0.0373 3.2157 3.0110 3.1044 0.0358 3.2025 3.0063 3.1048 0.0360 3.2036 3.0060 3.0919 0.0359 3.1903 2.9935 3.1216 0.0377 3.2250 3.0182 3.1018 0.0393 3.2094 2.9942 3.1008 0.0244 3.1677 3.0339 2.8 PASS PASS 3.1302 0.0293 3.2106 3.0499 2.8 PASS PASS 3.1203 0.0183 3.1705 3.0701 2.8 PASS PASS 3.1134 0.0233 3.1773 3.0496 3.0925 0.0306 3.1763 3.0087 2.8 PASS PASS 3.1258 0.0174 3.1734 3.0782 3.1022 0.0182 3.1520 3.0523 Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS P a g e 41 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Appendix A Picture of one among ten samples used in the test. The part type is in development and identification number will be marked on top of the future product. Figure A1: Top View showing serial number Figure A2: Bottom View P a g e 42 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Appendix B Radiation Bias Connection Tables Table B1: Biased Conditions PIN 1 2 3 4 FUNCTION NC SET VCONTROL IN CASE OUT CONNECTION / BIAS NC To ground via 10KΩ resistor To pin 4 To +3V To ground via 1uF To pin 3 To ground via 100Ω resistor To ground via 10uF capacitor Table B2: All GND’d PIN 1 2 3 4 CASE FUNCTION NC SET VCONTROL IN OUT CONNECTION / BIAS Ground Ground Ground Ground Ground P a g e 43 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Figure B1: Total Dose Bias Circuit Figure B2: Pin-Out P a g e 44 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Figure B3: Bias Board (top view) Figure B4: Bias Board (bottom view) P a g e 45 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Appendix C P a g e 46 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 P a g e 47 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 P a g e 48 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Appendix D Table D1: Pre-Irradiation Electrical Characteristics of Device-Under-Test P a g e 49 | 50 LINEAR TECHNOLOGY CORPORATION TID LDR RH3083MK HP201494 W2 Table D2: Post-Irradiation Electrical Characteristics of Device-Under-Test P a g e 50 | 50 LINEAR TECHNOLOGY CORPORATION