ELDRS Report_RH1573MJ8_Fab Lot W10809524.1 .pdf

ELDRS Report
08-125 090825 R1.1
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1573MJ8 Low Dropout PNP Regulator Driver for Linear Technology
Customer: Linear Technology (PO# 49796L)
RAD Job Number: 08-125
Part Type Tested: Linear Technology RH1573MJ8 Low Dropout PNP Regulator Driver
Commercial Part Number: RH1573K DICE. RH1573K DICE is assembled in CERDIP-8 package for testing
purposes.
Traceability Information: Fab Lot# W10809524.1, Wafer 6, Assembly lot# A21534.1 (Obtained from Linear
Technology PO 49796L). See photograph of unit under test in Appendix A.
Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit.
Serial numbers 1-5 were biased during irradiation, serial numbers 6-10 were unbiased during irradiation and serial
number 22 was used as the control. See Appendix B for the radiation bias connection table.
External Traveler: None Required
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware: LTS2020 Tester, 2510 Family Board, and RH1573/LT1573 BGSS-080908 DUT Board.
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5
Irradiation and Test Temperature: Room temperature for irradiation and test controlled to 24°C±6°C per MIL
STD 883G.
ELDRS Test Result: PASSED. All parts met datasheet specifications to
50krad(Si) with only minor degradation to VREF and no significant degradation
to any other measured parameter
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ELDRS Report
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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ELDRS Report
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Radiation Assured Devices
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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3.0.
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Radiation Test Conditions
The RH1573MJ8 low dropout PNP regulator driver described in this final report was tested using two bias
conditions, statically biased with a 7V VIN and all pins tied to ground, see Appendix A for details on
biasing conditions. These devices were irradiated to a maximum total ionizing dose level of 50krad(Si)
with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour
following the end of each irradiation segment. For intermediate irradiations, the units were tested and
returned to total dose exposure within two hours from the end of the previous radiation increment. The
ELDRS bias board was positioned in the Co-60 cell to provide the required 10mrad(Si)/s and was
located inside a lead-aluminum box. The lead-aluminum box is required under MIL-STD-883G
TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall
be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered
radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required.
This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as
CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when
the source is changed, or (3) when the orientation or configuration of the source, container, or testfixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the
device-irradiation container at the approximate test-device position. If it can be demonstrated that low
energy scattered radiation is small enough that it will not cause dosimetry errors due to dose
enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10.0mrad(Si)/s with a precision of ±5%.
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4.0.
Radiation Assured Devices
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Tested Parameters
The following parameters were tested during the course of this work:
1. Input Quiescent Current (A)
2. Reference Voltage (V)
3. Line Regulation (V)
4. Load Regulation (V)
5. FB Pin Bias Current (A)
6. DRIVE Pin Current VFB=1.35V (A)
7. DRIVE Pin Current VFB=1.15V (A)
8. DRIVE Pin Saturation Voltage ID=20mA (V)
9. DRIVE Pin Saturation Voltage ID=250mA (V)
10. SHDN Pin Threshold Voltage (V)
11. SHDN Pin Current (A)
12. LATCH Pin Latch-Off Threshold Voltage (V)
13. LATCH Pin Charging Current (A)
14. LATCH Pin Latching Current (A)
15. VIN-VOUT Diff Threshold Latch Disable (V)
16. Minimum Bias Voltage (V)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per
MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the ELDRS testing: following the radiation exposure the unit shall pass the specification
value and the average value for the each device must pass the specification value when the KTL limits
are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot
could be logged as an RLAT failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
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characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled “Radiation Lot
Acceptance Testing (RLAT) of the RH1573MJ8 Low dropout PNP regulator driver for Linear Technology”
to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1573MJ8 devices passed the ELDRS test to 50krad(Si) with
no significant degradation to most of the measured parameters. Where radiation induced degradation
was observed the degradation was not sufficient to cause the parameter to exceed the specification value.
Note that VREF exceeded the upper datasheet specification after application of the 90/90 KTL statistics
due to the relative large standard deviation of the sample population compared to the very tight
specification limits. In our opinion this lot of material could be qualified to 50krad(Si) using larger
samples sizes and an “attributes” approach, i.e. 22 units passing with 0 failures.
Figures 5.1 through 5.16 show plots of all the measured parameters versus total ionizing dose. In the
data plots the solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
Tables 5.1 through 5.16 show the raw data, averages, standard deviation, +KTL statistics, -KTL
statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of
all the figures in this results section to facilitate the location of a particular parameter.
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ELDRS Report
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Radiation Assured Devices
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As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the
specification even after application of the KTL statistics (with certain exceptions, as noted below). The
control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained under control during the course of the testing.
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ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-03
Input Quiescent Current (A)
2.80E-03
2.60E-03
2.40E-03
2.20E-03
2.00E-03
1.80E-03
1.60E-03
1.40E-03
1.20E-03
1.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.1. Plot of Input Quiescent Current (A) versus total dose. The data show no significant change with
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
08-125 090825 R1.1
Table 5.1. Raw data for Input Quiescent Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Quiescent Current (A)
Device
1
2
3
4
5
6
7
8
9
10
22
0
1.53E-03
1.53E-03
1.34E-03
1.54E-03
1.51E-03
1.55E-03
1.57E-03
1.54E-03
1.55E-03
1.48E-03
1.49E-03
10
1.53E-03
1.52E-03
1.36E-03
1.54E-03
1.51E-03
1.55E-03
1.58E-03
1.55E-03
1.56E-03
1.49E-03
1.48E-03
20
1.53E-03
1.52E-03
1.39E-03
1.54E-03
1.52E-03
1.55E-03
1.58E-03
1.55E-03
1.56E-03
1.51E-03
1.49E-03
30
1.53E-03
1.53E-03
1.40E-03
1.55E-03
1.53E-03
1.55E-03
1.59E-03
1.55E-03
1.56E-03
1.51E-03
1.49E-03
50
1.53E-03
1.53E-03
1.45E-03
1.55E-03
1.54E-03
1.56E-03
1.60E-03
1.55E-03
1.57E-03
1.53E-03
1.49E-03
Biased Statistics
Average Biased
1.49E-03 1.49E-03 1.50E-03 1.51E-03 1.52E-03
Std Dev Biased
8.31E-05 7.45E-05 6.31E-05 5.78E-05 4.15E-05
Ps90%/90% (+KTL) Biased
1.72E-03 1.70E-03 1.67E-03 1.66E-03 1.63E-03
Ps90%/90% (-KTL) Biased
1.26E-03 1.29E-03 1.33E-03 1.35E-03 1.40E-03
Un-Biased Statistics
Average Un-Biased
1.54E-03 1.55E-03 1.55E-03 1.55E-03 1.56E-03
Std Dev Un-Biased
3.43E-05 3.16E-05 2.81E-05 2.86E-05 2.59E-05
Ps90%/90% (+KTL) Un-Biased
1.63E-03 1.63E-03 1.63E-03 1.63E-03 1.63E-03
Ps90%/90% (-KTL) Un-Biased
1.44E-03 1.46E-03 1.47E-03 1.47E-03 1.49E-03
Specification MAX
2.80E-03 2.80E-03 2.80E-03 2.80E-03 2.85E-03
Status
PASS
PASS
PASS
PASS
PASS
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24 hr
Anneal
168 hr
Anneal
60
1.53E-03
1.53E-03
1.44E-03
1.55E-03
1.54E-03
1.56E-03
1.60E-03
1.56E-03
1.57E-03
1.53E-03
1.49E-03
70
1.53E-03
1.53E-03
1.43E-03
1.55E-03
1.54E-03
1.55E-03
1.59E-03
1.55E-03
1.56E-03
1.52E-03
1.49E-03
1.52E-03
4.51E-05
1.64E-03
1.39E-03
1.51E-03
4.63E-05
1.64E-03
1.39E-03
1.56E-03
2.60E-05
1.63E-03
1.49E-03
2.85E-03
PASS
1.56E-03
2.58E-05
1.63E-03
1.48E-03
2.85E-03
PASS
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ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.290E+00
1.285E+00
Reference Voltage (V)
1.280E+00
1.275E+00
1.270E+00
1.265E+00
1.260E+00
1.255E+00
1.250E+00
1.245E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.2. Plot of Reference Voltage (V) versus total dose. The data show no significant change with total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
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Table 5.2. Raw data for Reference Voltage (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24 hr
Anneal
Total Dose (krad(Si))
Reference Voltage (V)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
168 hr
Anneal
0
1.274
1.270
1.263
1.276
1.269
1.270
1.269
1.272
1.273
1.268
1.268
10
1.275
1.271
1.264
1.276
1.269
1.271
1.269
1.273
1.274
1.269
1.269
20
1.275
1.273
1.265
1.278
1.270
1.272
1.270
1.274
1.274
1.269
1.269
30
1.275
1.273
1.266
1.278
1.271
1.273
1.271
1.274
1.275
1.270
1.268
50
1.276
1.274
1.267
1.279
1.271
1.274
1.271
1.275
1.276
1.270
1.268
60
1.276
1.274
1.266
1.279
1.271
1.273
1.271
1.275
1.276
1.270
1.269
70
1.276
1.274
1.267
1.279
1.271
1.273
1.271
1.275
1.276
1.270
1.271
1.270E+00
5.030E-03
1.284E+00
1.257E+00
1.271E+00
4.848E-03
1.284E+00
1.258E+00
1.272E+00
4.970E-03
1.286E+00
1.259E+00
1.273E+00
4.506E-03
1.285E+00
1.260E+00
1.273E+00
4.615E-03
1.286E+00
1.261E+00
1.273E+00
4.970E-03
1.287E+00
1.260E+00
1.273E+00
4.615E-03
1.286E+00
1.261E+00
1.270E+00
2.074E-03
1.276E+00
1.265E+00
1.252E+00
PASS
1.278E+00
FAIL
1.271E+00
2.280E-03
1.277E+00
1.265E+00
1.252E+00
PASS
1.278E+00
FAIL
1.272E+00
2.280E-03
1.278E+00
1.266E+00
1.252E+00
PASS
1.278E+00
FAIL
1.273E+00
2.074E-03
1.278E+00
1.267E+00
1.252E+00
PASS
1.278E+00
FAIL
1.273E+00
2.588E-03
1.280E+00
1.266E+00
1.249E+00
PASS
1.281E+00
FAIL
1.273E+00
2.550E-03
1.280E+00
1.266E+00
1.249E+00
PASS
1.281E+00
FAIL
1.273E+00
2.550E-03
1.280E+00
1.266E+00
1.249E+00
PASS
1.281E+00
FAIL
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
3.00E-03
Line Regulation (V)
2.00E-03
1.00E-03
0.00E+00
-1.00E-03
-2.00E-03
-3.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.3. Plot of Line Regulation (V) versus total dose. The data show no significant change with total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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ELDRS Report
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Table 5.3. Raw data for Line Regulation (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
24 hr
Anneal
168 hr
Anneal
50
3.13E-04
1.24E-04
3.08E-04
-8.30E-05
-1.10E-05
3.12E-04
-7.70E-05
-7.80E-05
1.20E-05
-3.40E-05
3.70E-05
60
2.36E-04
2.51E-04
1.99E-04
1.33E-04
-8.70E-05
-1.03E-04
7.20E-05
1.19E-04
3.86E-04
2.74E-04
-1.06E-04
70
2.90E-05
1.05E-04
6.30E-05
-1.18E-04
1.00E-06
1.30E-05
2.00E-04
-1.31E-04
-1.21E-04
3.96E-04
9.00E-05
3.20E-06 0.00E+00 7.94E-05 1.30E-04
1.31E-04 1.17E-04 1.55E-04 1.81E-04
3.63E-04 3.21E-04 5.05E-04 6.25E-04
-3.57E-04 -3.21E-04 -3.46E-04 -3.65E-04
1.46E-04
1.38E-04
5.25E-04
-2.33E-04
1.60E-05
8.44E-05
2.47E-04
-2.15E-04
1.50E-04
1.88E-04
6.66E-04
-3.67E-04
-2.50E-03
PASS
2.50E-03
PASS
7.14E-05
2.25E-04
6.90E-04
-5.47E-04
-2.50E-03
PASS
2.50E-03
PASS
Total Dose (krad(Si))
Line Regulation (V)
Device
1
2
3
4
5
6
7
8
9
10
22
0
-9.00E-06
-2.70E-05
-8.20E-05
1.72E-04
-1.04E-04
-1.00E-04
1.73E-04
1.74E-04
3.40E-05
6.50E-05
1.78E-04
Biased Statistics
Average Biased
-1.00E-05
Std Dev Biased
1.09E-04
Ps90%/90% (+KTL) Biased
2.89E-04
Ps90%/90% (-KTL) Biased
-3.09E-04
Un-Biased Statistics
Average Un-Biased
6.92E-05
Std Dev Un-Biased
1.14E-04
Ps90%/90% (+KTL) Un-Biased
3.81E-04
Ps90%/90% (-KTL) Un-Biased
-2.42E-04
Specification MIN
-2.00E-03
Status
PASS
Specification MAX
2.00E-03
Status
PASS
10
1.61E-04
1.31E-04
-9.20E-05
-7.70E-05
-1.07E-04
-2.90E-05
2.40E-04
2.20E-04
-1.35E-04
2.67E-04
2.49E-04
1.13E-04
1.82E-04
6.13E-04
-3.87E-04
-2.10E-03
PASS
2.10E-03
PASS
20
-1.19E-04
-3.90E-05
-8.60E-05
9.00E-05
1.54E-04
1.94E-04
-7.50E-05
-9.40E-05
1.63E-04
-9.30E-05
1.96E-04
1.90E-05
1.46E-04
4.20E-04
-3.82E-04
-2.20E-03
PASS
2.20E-03
PASS
30
-1.08E-04
2.40E-04
1.87E-04
1.40E-04
-6.20E-05
-8.50E-05
2.57E-04
1.41E-04
9.40E-05
2.52E-04
-9.60E-05
1.32E-04
1.40E-04
5.16E-04
-2.53E-04
-2.20E-03
PASS
2.20E-03
PASS
An ISO 9001:2000 Certified Company
13
2.70E-05
1.64E-04
4.75E-04
-4.21E-04
-2.50E-03
PASS
2.50E-03
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.50E-02
2.00E-02
Load Regulation (V)
1.50E-02
1.00E-02
5.00E-03
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.4. Plot of Load Regulation (V) versus total dose. The data show no significant change with total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.4. Raw data for Load Regulation (V) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Load Regulation (V)
Device
1
2
3
4
5
6
7
8
9
10
22
24 hr
Anneal
168 hr
Anneal
0
10
20
30
50
60
70
-5.34E-03 -2.65E-03 1.96E-03 3.71E-03 -2.20E-03 8.10E-05 6.52E-04
1.55E-03 2.04E-03 5.70E-04 3.26E-03 8.10E-05 2.00E-03 0.00E+00
2.04E-03 2.53E-03 2.04E-03 2.53E-03 2.04E-03 2.53E-03 2.04E-03
2.36E-03 1.87E-03 1.96E-03 2.00E-03 3.71E-03 -4.16E-03 1.10E-03
2.24E-03 2.04E-03 2.04E-03 2.04E-03 2.04E-03 -2.04E-03 2.04E-03
7.33E-04 8.15E-04 4.10E-05 8.15E-04 2.00E-03 2.04E-03 2.04E-03
2.44E-04 2.08E-03 3.26E-04 3.26E-04 2.08E-03 1.67E-03 2.04E-03
2.20E-03 3.95E-03 2.49E-03 2.04E-03 2.32E-03 2.81E-03 3.06E-03
3.79E-03 2.04E-03 2.16E-03 2.00E-03 2.53E-03 5.30E-04 1.83E-03
-5.70E-04 -4.48E-04 2.04E-03 -4.86E-03 1.87E-03 1.39E-03 7.74E-04
1.87E-03 3.67E-04 -4.08E-03 -1.63E-02 2.77E-03 7.33E-04 -2.04E-02
Biased Statistics
Average Biased
5.71E-04
Std Dev Biased
3.32E-03
Ps90%/90% (+KTL) Biased
9.66E-03
Ps90%/90% (-KTL) Biased
-8.52E-03
Un-Biased Statistics
Average Un-Biased
1.28E-03
Std Dev Un-Biased
1.73E-03
Ps90%/90% (+KTL) Un-Biased
6.02E-03
Ps90%/90% (-KTL) Un-Biased
-3.46E-03
Specification MIN
-1.80E-02
Status
PASS
Specification MAX
1.80E-02
Status
PASS
1.17E-03 1.71E-03
2.15E-03 6.39E-04
7.05E-03 3.46E-03
-4.72E-03 -4.16E-05
1.69E-03
1.64E-03
6.18E-03
-2.80E-03
-1.90E-02
PASS
1.90E-02
PASS
1.41E-03
1.14E-03
4.53E-03
-1.71E-03
-2.00E-02
PASS
2.00E-02
PASS
2.71E-03 1.13E-03
7.57E-04 2.26E-03
4.78E-03 7.34E-03
6.29E-04 -5.07E-03
-3.18E-04
2.80E-03
7.35E-03
-7.99E-03
1.17E-03
8.87E-04
3.60E-03
-1.27E-03
6.28E-05 2.16E-03 1.69E-03
2.85E-03 2.62E-04 8.39E-04
7.88E-03 2.88E-03 3.99E-03
-7.76E-03 1.44E-03 -6.15E-04
-2.00E-02 -2.20E-02 -2.20E-02
PASS
PASS
PASS
2.00E-02 2.20E-02 2.20E-02
PASS
PASS
PASS
1.95E-03
8.12E-04
4.17E-03
-2.78E-04
-2.20E-02
PASS
2.20E-02
PASS
An ISO 9001:2000 Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-06
FB Pin Bias Current (A)
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.5. Plot of FB Pin Bias Current (A) versus total dose. The data show no significant change with total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.5. Raw data for FB Pin Bias Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
FB Pin Bias Current (A)
Device
1
2
3
4
5
6
7
8
9
10
22
0
5.49E-07
4.79E-07
5.15E-07
6.13E-07
5.43E-07
4.84E-07
5.59E-07
5.07E-07
4.67E-07
4.70E-07
5.40E-07
10
5.51E-07
4.79E-07
5.23E-07
6.19E-07
5.42E-07
4.91E-07
5.86E-07
5.24E-07
4.74E-07
4.74E-07
5.40E-07
20
5.70E-07
4.89E-07
5.24E-07
6.22E-07
5.52E-07
4.98E-07
5.80E-07
5.23E-07
4.82E-07
4.84E-07
5.42E-07
30
5.56E-07
4.90E-07
5.37E-07
6.29E-07
5.61E-07
5.21E-07
5.93E-07
5.37E-07
4.88E-07
4.84E-07
5.40E-07
50
5.86E-07
4.97E-07
5.49E-07
6.54E-07
5.77E-07
5.24E-07
6.14E-07
5.52E-07
5.07E-07
4.93E-07
5.35E-07
Biased Statistics
Average Biased
5.40E-07 5.43E-07 5.51E-07 5.55E-07 5.73E-07
Std Dev Biased
4.94E-08 5.08E-08 4.99E-08 5.02E-08 5.72E-08
Ps90%/90% (+KTL) Biased
6.75E-07 6.82E-07 6.88E-07 6.92E-07 7.30E-07
Ps90%/90% (-KTL) Biased
4.04E-07 4.03E-07 4.14E-07 4.17E-07 4.16E-07
Un-Biased Statistics
Average Un-Biased
4.97E-07 5.10E-07 5.13E-07 5.25E-07 5.38E-07
Std Dev Un-Biased
3.79E-08 4.72E-08 4.07E-08 4.43E-08 4.78E-08
Ps90%/90% (+KTL) Un-Biased
6.01E-07 6.39E-07 6.25E-07 6.46E-07 6.69E-07
Ps90%/90% (-KTL) Un-Biased
3.94E-07 3.80E-07 4.02E-07 4.03E-07 4.07E-07
Specification MIN
-4.00E-06 -4.20E-06 -4.50E-06 -4.50E-06 -5.00E-06
Status
PASS
PASS
PASS
PASS
PASS
Specification MAX
4.00E-06 4.20E-06 4.50E-06 4.50E-06 5.00E-06
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
17
24 hr
Anneal
168 hr
Anneal
60
5.89E-07
5.16E-07
5.45E-07
6.57E-07
5.79E-07
5.33E-07
6.12E-07
5.49E-07
5.16E-07
5.09E-07
5.40E-07
70
5.61E-07
4.86E-07
5.37E-07
6.34E-07
5.54E-07
5.03E-07
5.87E-07
5.37E-07
4.84E-07
4.84E-07
5.44E-07
5.77E-07
5.31E-08
7.23E-07
4.32E-07
5.54E-07
5.33E-08
7.01E-07
4.08E-07
5.44E-07
4.12E-08
6.57E-07
4.31E-07
-5.00E-06
PASS
5.00E-06
PASS
5.19E-07
4.37E-08
6.39E-07
3.99E-07
-5.00E-06
PASS
5.00E-06
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.20E-03
DRIVE Pin Current VFB=1.35V (A)
1.70E-03
1.20E-03
7.00E-04
2.00E-04
-3.00E-04
-8.00E-04
-1.30E-03
-1.80E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.6. Plot of DRIVE Pin Current VFB=1.35V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.6. Raw data for DRIVE Pin Current VFB=1.35V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
50
5.00E-06
1.00E-06
3.00E-06
4.00E-06
5.00E-06
5.00E-06
3.00E-06
3.00E-06
4.00E-06
3.00E-06
3.00E-06
60
1.00E-06
5.00E-06
3.00E-06
1.00E-06
4.00E-06
4.00E-06
3.00E-06
4.00E-06
3.00E-06
3.00E-06
1.00E-06
70
4.00E-06
3.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
4.00E-06
4.60E-06 4.20E-06 3.60E-06
5.48E-07 1.79E-06 1.67E-06
6.10E-06 9.11E-06 8.19E-06
3.10E-06 -7.05E-07 -9.88E-07
2.80E-06
1.79E-06
7.71E-06
-2.11E-06
4.40E-06
8.94E-07
6.85E-06
1.95E-06
Total Dose (krad(Si))
DRIVE Pin Current VFB=1.35V (A)
0
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
10
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06 5.00E-06
0.00E+00 0.00E+00
5.00E-06 5.00E-06
5.00E-06 5.00E-06
20
5.00E-06
5.00E-06
4.00E-06
4.00E-06
5.00E-06
4.00E-06
4.00E-06
5.00E-06
5.00E-06
5.00E-06
3.00E-06
30
5.00E-06
5.00E-06
1.00E-06
5.00E-06
5.00E-06
4.00E-06
5.00E-06
4.00E-06
5.00E-06
4.00E-06
4.00E-06
5.00E-06 5.00E-06 4.60E-06 4.40E-06 3.60E-06
0.00E+00 0.00E+00 5.48E-07 5.48E-07 8.94E-07
5.00E-06 5.00E-06 6.10E-06 5.90E-06 6.05E-06
5.00E-06 5.00E-06 3.10E-06 2.90E-06 1.15E-06
1.20E-03 1.30E-03 1.40E-03 1.40E-03 1.70E-03
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
19
3.40E-06 5.00E-06
5.48E-07 0.00E+00
4.90E-06 5.00E-06
1.90E-06 5.00E-06
1.70E-03 1.70E-03
PASS
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
DRIVE Pin Current VFB=1.15V (A)
5.00E-01
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.7. Plot of DRIVE Pin Current VFB=1.15V (A) versus total dose. The data show no significant
change with total dose. The solid diamonds are the average of the measured data points for the samples
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.7. Raw data for DRIVE Pin Current VFB=1.15V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
DRIVE Pin Current VFB=1.15V (A)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.53E-01
4.65E-01
4.70E-01
4.37E-01
4.59E-01
4.69E-01
4.56E-01
4.67E-01
4.59E-01
4.66E-01
4.51E-01
10
4.53E-01
4.66E-01
4.73E-01
4.38E-01
4.59E-01
4.70E-01
4.56E-01
4.67E-01
4.60E-01
4.66E-01
4.50E-01
20
4.52E-01
4.69E-01
4.75E-01
4.40E-01
4.62E-01
4.72E-01
4.58E-01
4.69E-01
4.61E-01
4.68E-01
4.52E-01
30
4.56E-01
4.69E-01
4.75E-01
4.41E-01
4.62E-01
4.69E-01
4.59E-01
4.68E-01
4.61E-01
4.68E-01
4.52E-01
50
4.55E-01
4.69E-01
4.76E-01
4.40E-01
4.62E-01
4.73E-01
4.60E-01
4.70E-01
4.63E-01
4.69E-01
4.52E-01
60
4.54E-01
4.68E-01
4.74E-01
4.39E-01
4.61E-01
4.72E-01
4.58E-01
4.69E-01
4.62E-01
4.68E-01
4.51E-01
70
4.53E-01
4.67E-01
4.73E-01
4.39E-01
4.60E-01
4.71E-01
4.58E-01
4.68E-01
4.61E-01
4.67E-01
4.51E-01
4.57E-01
1.28E-02
4.92E-01
4.22E-01
4.58E-01
1.32E-02
4.94E-01
4.21E-01
4.59E-01
1.38E-02
4.97E-01
4.22E-01
4.60E-01
1.31E-02
4.96E-01
4.25E-01
4.60E-01
1.36E-02
4.98E-01
4.23E-01
4.59E-01
1.33E-02
4.96E-01
4.23E-01
4.58E-01
1.34E-02
4.95E-01
4.22E-01
4.63E-01 4.64E-01 4.65E-01 4.65E-01 4.67E-01
5.72E-03 5.47E-03 5.56E-03 4.65E-03 5.50E-03
4.79E-01 4.79E-01 4.81E-01 4.78E-01 4.82E-01
4.48E-01 4.49E-01 4.50E-01 4.52E-01 4.52E-01
2.90E-01 2.90E-01 2.88E-01 2.88E-01 2.85E-01
PASS
PASS
PASS
PASS
PASS
4.66E-01
5.51E-03
4.81E-01
4.51E-01
2.85E-01
PASS
4.65E-01
5.46E-03
4.80E-01
4.50E-01
2.85E-01
PASS
An ISO 9001:2000 Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
DRIVE Pin Saturation Voltage ID=20mA (V)
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.8. Plot of DRIVE Pin Saturation Voltage ID=20mA (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.8. Raw data for DRIVE Pin Saturation Voltage ID=20mA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
DRIVE Pin Saturation Voltage ID=20mA (V)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.19E-01
1.18E-01
1.18E-01
1.19E-01
1.17E-01
1.17E-01
1.17E-01
1.17E-01
1.19E-01
1.18E-01
1.18E-01
10
1.19E-01
1.17E-01
1.17E-01
1.19E-01
1.18E-01
1.17E-01
1.17E-01
1.17E-01
1.18E-01
1.18E-01
1.18E-01
20
1.23E-01
1.19E-01
1.18E-01
1.20E-01
1.19E-01
1.18E-01
1.18E-01
1.18E-01
1.19E-01
1.19E-01
1.19E-01
30
1.20E-01
1.18E-01
1.18E-01
1.21E-01
1.19E-01
1.20E-01
1.19E-01
1.17E-01
1.19E-01
1.19E-01
1.20E-01
50
1.21E-01
1.19E-01
1.18E-01
1.20E-01
1.19E-01
1.19E-01
1.19E-01
1.18E-01
1.19E-01
1.19E-01
1.19E-01
60
1.19E-01
1.18E-01
1.17E-01
1.20E-01
1.18E-01
1.17E-01
1.17E-01
1.17E-01
1.19E-01
1.18E-01
1.19E-01
70
1.19E-01
1.19E-01
1.17E-01
1.20E-01
1.17E-01
1.17E-01
1.17E-01
1.17E-01
1.19E-01
1.18E-01
1.20E-01
1.18E-01
8.37E-04
1.20E-01
1.16E-01
1.18E-01
1.00E-03
1.21E-01
1.15E-01
1.20E-01
1.92E-03
1.25E-01
1.15E-01
1.19E-01
1.30E-03
1.23E-01
1.16E-01
1.19E-01
1.14E-03
1.23E-01
1.16E-01
1.18E-01
1.14E-03
1.22E-01
1.15E-01
1.18E-01
1.34E-03
1.22E-01
1.15E-01
1.18E-01 1.17E-01 1.18E-01 1.19E-01 1.19E-01
8.94E-04 5.48E-04 5.48E-04 1.10E-03 4.47E-04
1.20E-01 1.19E-01 1.20E-01 1.22E-01 1.20E-01
1.15E-01 1.16E-01 1.17E-01 1.16E-01 1.18E-01
2.00E-01 2.00E-01 2.10E-01 2.10E-01 2.30E-01
PASS
PASS
PASS
PASS
PASS
1.18E-01
8.94E-04
1.20E-01
1.15E-01
2.30E-01
PASS
1.18E-01
8.94E-04
1.20E-01
1.15E-01
2.30E-01
PASS
An ISO 9001:2000 Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
DRIVE Pin Saturation Voltage ID=250mA (V)
1.20E+00
1.00E+00
8.00E-01
6.00E-01
4.00E-01
2.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.9. Plot of DRIVE Pin Saturation Voltage ID=250mA (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.9. Raw data for DRIVE Pin Saturation Voltage ID=250mA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
DRIVE Pin Saturation Voltage ID=250mA (V)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.94E-01
6.72E-01
6.86E-01
6.92E-01
6.78E-01
6.74E-01
6.85E-01
6.69E-01
6.80E-01
6.77E-01
6.81E-01
10
6.92E-01
6.77E-01
6.67E-01
6.88E-01
6.83E-01
6.77E-01
6.80E-01
6.67E-01
6.82E-01
6.81E-01
6.80E-01
20
7.44E-01
6.77E-01
6.74E-01
6.95E-01
6.85E-01
6.78E-01
6.83E-01
6.69E-01
6.83E-01
6.80E-01
6.89E-01
30
7.03E-01
6.69E-01
6.69E-01
7.13E-01
6.87E-01
7.04E-01
6.92E-01
6.69E-01
6.83E-01
6.87E-01
7.00E-01
50
7.06E-01
6.78E-01
6.76E-01
6.95E-01
6.83E-01
6.81E-01
6.83E-01
6.69E-01
6.83E-01
6.82E-01
6.83E-01
60
6.82E-01
6.69E-01
6.65E-01
7.01E-01
6.83E-01
6.69E-01
6.81E-01
6.69E-01
6.83E-01
6.76E-01
6.83E-01
70
6.85E-01
6.80E-01
6.68E-01
6.92E-01
6.80E-01
6.69E-01
6.82E-01
6.69E-01
6.83E-01
6.74E-01
7.06E-01
6.84E-01
9.32E-03
7.10E-01
6.59E-01
6.81E-01
9.81E-03
7.08E-01
6.54E-01
6.95E-01
2.86E-02
7.73E-01
6.17E-01
6.88E-01
1.98E-02
7.43E-01
6.34E-01
6.88E-01
1.27E-02
7.22E-01
6.53E-01
6.80E-01
1.41E-02
7.19E-01
6.41E-01
6.81E-01
8.77E-03
7.05E-01
6.57E-01
6.77E-01 6.77E-01 6.79E-01 6.87E-01 6.80E-01
6.04E-03 6.11E-03 5.77E-03 1.28E-02 5.98E-03
6.94E-01 6.94E-01 6.94E-01 7.22E-01 6.96E-01
6.60E-01 6.61E-01 6.63E-01 6.52E-01 6.63E-01
1.00E+00 1.00E+00 1.02E+00 1.02E+00 1.05E+00
PASS
PASS
PASS
PASS
PASS
6.76E-01
6.54E-03
6.94E-01
6.58E-01
1.05E+00
PASS
6.75E-01
6.80E-03
6.94E-01
6.57E-01
1.05E+00
PASS
An ISO 9001:2000 Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
SHDN Pin Threshold Voltage (V)
1.60E+00
1.50E+00
1.40E+00
1.30E+00
1.20E+00
1.10E+00
1.00E+00
9.00E-01
8.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of SHDN Pin Threshold Voltage (V) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.10. Raw data for SHDN Pin Threshold Voltage (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
SHDN Pin Threshold Voltage (V)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.26E+00
1.26E+00
1.26E+00
1.26E+00
1.26E+00
1.26E+00
1.26E+00
1.25E+00
1.27E+00
1.25E+00
1.26E+00
10
1.26E+00
1.26E+00
1.26E+00
1.26E+00
1.27E+00
1.26E+00
1.27E+00
1.26E+00
1.27E+00
1.26E+00
1.26E+00
20
1.27E+00
1.26E+00
1.26E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.26E+00
1.27E+00
1.26E+00
1.26E+00
30
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.26E+00
1.28E+00
1.26E+00
1.25E+00
50
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.28E+00
1.28E+00
1.28E+00
1.27E+00
1.28E+00
1.27E+00
1.26E+00
24 hr
Anneal
168 hr
Anneal
60
1.28E+00
1.27E+00
1.27E+00
1.27E+00
1.28E+00
1.27E+00
1.28E+00
1.27E+00
1.28E+00
1.27E+00
1.26E+00
70
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.27E+00
1.26E+00
1.28E+00
1.26E+00
1.25E+00
1.26E+00 1.26E+00 1.27E+00 1.27E+00 1.27E+00 1.27E+00 1.27E+00
2.74E-03 2.24E-03 3.42E-03 2.19E-03 2.88E-03 2.51E-03 3.21E-03
1.27E+00 1.27E+00 1.28E+00 1.27E+00 1.28E+00 1.28E+00 1.28E+00
1.25E+00 1.26E+00 1.26E+00 1.26E+00 1.26E+00 1.27E+00 1.26E+00
1.26E+00
5.98E-03
1.28E+00
1.24E+00
1.00E+00
PASS
1.50E+00
PASS
1.26E+00
6.52E-03
1.28E+00
1.24E+00
1.00E+00
PASS
1.50E+00
PASS
1.27E+00
4.55E-03
1.28E+00
1.25E+00
1.00E+00
PASS
1.50E+00
PASS
1.27E+00
6.72E-03
1.29E+00
1.25E+00
1.00E+00
PASS
1.50E+00
PASS
An ISO 9001:2000 Certified Company
27
1.27E+00
6.23E-03
1.29E+00
1.26E+00
1.00E+00
PASS
1.52E+00
PASS
1.27E+00
6.52E-03
1.29E+00
1.25E+00
1.00E+00
PASS
1.52E+00
PASS
1.27E+00
6.50E-03
1.29E+00
1.25E+00
1.00E+00
PASS
1.52E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.50E-04
SHDN Pin Current (A)
3.00E-04
2.50E-04
2.00E-04
1.50E-04
1.00E-04
5.00E-05
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.11. Plot of SHDN Pin Current (A) versus total dose. The data show no significant change with total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.11. Raw data for SHDN Pin Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
SHDN Pin Current (A)
Device
1
2
3
4
5
6
7
8
9
10
22
0
1.29E-04
1.30E-04
1.31E-04
1.31E-04
1.29E-04
1.30E-04
1.32E-04
1.31E-04
1.30E-04
1.30E-04
1.29E-04
10
1.29E-04
1.29E-04
1.30E-04
1.30E-04
1.29E-04
1.30E-04
1.31E-04
1.30E-04
1.30E-04
1.29E-04
1.30E-04
20
1.28E-04
1.28E-04
1.29E-04
1.30E-04
1.28E-04
1.29E-04
1.31E-04
1.29E-04
1.28E-04
1.29E-04
1.29E-04
30
1.28E-04
1.28E-04
1.29E-04
1.29E-04
1.28E-04
1.29E-04
1.31E-04
1.29E-04
1.29E-04
1.29E-04
1.30E-04
50
1.27E-04
1.27E-04
1.28E-04
1.28E-04
1.27E-04
1.28E-04
1.30E-04
1.28E-04
1.27E-04
1.27E-04
1.29E-04
Biased Statistics
Average Biased
1.30E-04 1.30E-04 1.29E-04 1.29E-04 1.27E-04
Std Dev Biased
8.04E-07 7.37E-07 7.89E-07 8.03E-07 8.76E-07
Ps90%/90% (+KTL) Biased
1.32E-04 1.32E-04 1.31E-04 1.31E-04 1.30E-04
Ps90%/90% (-KTL) Biased
1.28E-04 1.28E-04 1.27E-04 1.26E-04 1.25E-04
Un-Biased Statistics
Average Un-Biased
1.30E-04 1.30E-04 1.29E-04 1.29E-04 1.28E-04
Std Dev Un-Biased
9.12E-07 8.04E-07 9.49E-07 8.36E-07 9.41E-07
Ps90%/90% (+KTL) Un-Biased
1.33E-04 1.32E-04 1.32E-04 1.32E-04 1.31E-04
Ps90%/90% (-KTL) Un-Biased
1.28E-04 1.28E-04 1.27E-04 1.27E-04 1.25E-04
Specification MAX
3.00E-04 3.00E-04 3.00E-04 3.00E-04 3.00E-04
Status
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2000 Certified Company
29
24 hr
Anneal
168 hr
Anneal
60
1.27E-04
1.28E-04
1.29E-04
1.29E-04
1.27E-04
1.28E-04
1.30E-04
1.29E-04
1.28E-04
1.28E-04
1.29E-04
70
1.28E-04
1.28E-04
1.30E-04
1.29E-04
1.28E-04
1.29E-04
1.30E-04
1.29E-04
1.28E-04
1.28E-04
1.30E-04
1.28E-04
8.45E-07
1.30E-04
1.26E-04
1.28E-04
7.97E-07
1.31E-04
1.26E-04
1.29E-04
9.35E-07
1.31E-04
1.26E-04
3.00E-04
PASS
1.29E-04
7.57E-07
1.31E-04
1.27E-04
3.00E-04
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
LATCH Pin Latch-Off Threshold Voltage (V)
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.12. Plot of LATCH Pin Latch-Off Threshold Voltage (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.12. Raw data for LATCH Pin Latch-Off Threshold Voltage (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
LATCH Pin Latch-Off Threshold Voltage (V)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.33E+00
1.32E+00
1.33E+00
1.34E+00
1.33E+00
1.32E+00
1.33E+00
1.32E+00
1.32E+00
1.32E+00
1.33E+00
10
1.34E+00
1.33E+00
1.33E+00
1.34E+00
1.33E+00
1.33E+00
1.34E+00
1.33E+00
1.33E+00
1.32E+00
1.33E+00
20
1.33E+00
1.31E+00
1.32E+00
1.32E+00
1.32E+00
1.32E+00
1.33E+00
1.32E+00
1.32E+00
1.32E+00
1.33E+00
30
1.32E+00
1.32E+00
1.32E+00
1.33E+00
1.33E+00
1.32E+00
1.33E+00
1.33E+00
1.33E+00
1.32E+00
1.33E+00
50
1.32E+00
1.31E+00
1.31E+00
1.32E+00
1.32E+00
1.31E+00
1.32E+00
1.31E+00
1.31E+00
1.31E+00
1.32E+00
24 hr
Anneal
168 hr
Anneal
60
1.33E+00
1.32E+00
1.32E+00
1.34E+00
1.33E+00
1.32E+00
1.33E+00
1.32E+00
1.32E+00
1.32E+00
1.33E+00
70
1.32E+00
1.32E+00
1.32E+00
1.33E+00
1.33E+00
1.32E+00
1.33E+00
1.32E+00
1.32E+00
1.32E+00
1.33E+00
1.33E+00 1.33E+00 1.32E+00 1.32E+00 1.31E+00 1.33E+00 1.32E+00
5.70E-03 4.18E-03 5.70E-03 5.70E-03 6.43E-03 7.42E-03 5.70E-03
1.35E+00 1.34E+00 1.34E+00 1.34E+00 1.33E+00 1.35E+00 1.34E+00
1.31E+00 1.32E+00 1.30E+00 1.31E+00 1.30E+00 1.31E+00 1.31E+00
1.32E+00
4.47E-03
1.34E+00
1.31E+00
1.10E+00
PASS
1.80E+00
PASS
1.33E+00
5.48E-03
1.34E+00
1.31E+00
1.00E+00
PASS
1.90E+00
PASS
1.32E+00
4.77E-03
1.33E+00
1.31E+00
1.00E+00
PASS
2.00E+00
PASS
1.33E+00
4.18E-03
1.34E+00
1.31E+00
1.00E+00
PASS
2.00E+00
PASS
An ISO 9001:2000 Certified Company
31
1.31E+00
4.32E-03
1.32E+00
1.30E+00
9.00E-01
PASS
2.10E+00
PASS
1.32E+00
5.48E-03
1.34E+00
1.31E+00
9.00E-01
PASS
2.10E+00
PASS
1.32E+00
4.18E-03
1.33E+00
1.31E+00
9.00E-01
PASS
2.10E+00
PASS
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
LATCH Pin Charging Current (A)
1.20E-05
1.00E-05
8.00E-06
6.00E-06
4.00E-06
2.00E-06
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.13. Plot of LATCH Pin Charging Current (A) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.13. Raw data for LATCH Pin Charging Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
LATCH Pin Charging Current (A)
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.18E-06
4.88E-06
4.99E-06
5.40E-06
5.03E-06
5.03E-06
5.42E-06
5.00E-06
5.24E-06
4.94E-06
5.09E-06
10
5.49E-06
5.19E-06
5.29E-06
5.71E-06
5.34E-06
5.38E-06
5.79E-06
5.33E-06
5.62E-06
5.28E-06
5.23E-06
20
5.92E-06
5.37E-06
5.48E-06
5.82E-06
5.50E-06
5.54E-06
5.92E-06
5.46E-06
5.77E-06
5.42E-06
5.27E-06
30
5.86E-06
5.56E-06
5.69E-06
6.12E-06
5.70E-06
5.71E-06
6.15E-06
5.67E-06
6.03E-06
5.65E-06
5.35E-06
50
5.94E-06
5.74E-06
5.89E-06
6.18E-06
5.85E-06
5.86E-06
6.30E-06
5.80E-06
6.35E-06
5.79E-06
5.20E-06
60
5.98E-06
5.76E-06
5.90E-06
6.30E-06
5.89E-06
5.98E-06
6.26E-06
5.85E-06
6.31E-06
5.79E-06
5.15E-06
70
5.38E-06
5.21E-06
5.31E-06
5.64E-06
5.29E-06
5.36E-06
5.75E-06
5.28E-06
5.70E-06
5.17E-06
4.87E-06
5.10E-06
2.01E-07
5.65E-06
4.54E-06
5.40E-06
2.02E-07
5.96E-06
4.85E-06
5.62E-06
2.38E-07
6.27E-06
4.96E-06
5.78E-06
2.14E-07
6.37E-06
5.20E-06
5.92E-06
1.62E-07
6.36E-06
5.48E-06
5.97E-06
2.02E-07
6.52E-06
5.41E-06
5.37E-06
1.64E-07
5.82E-06
4.92E-06
5.12E-06 5.48E-06 5.62E-06 5.84E-06 6.02E-06
2.01E-07 2.17E-07 2.12E-07 2.33E-07 2.81E-07
5.68E-06 6.07E-06 6.21E-06 6.48E-06 6.79E-06
4.57E-06 4.88E-06 5.04E-06 5.20E-06 5.25E-06
4.00E-06 4.40E-06 4.40E-06 4.40E-06 4.20E-06
PASS
PASS
PASS
PASS
PASS
1.00E-05 1.00E-05 1.00E-05 1.00E-05 1.05E-05
PASS
PASS
PASS
PASS
PASS
6.04E-06
2.38E-07
6.69E-06
5.38E-06
4.20E-06
PASS
1.05E-05
PASS
5.45E-06
2.55E-07
6.15E-06
4.75E-06
4.20E-06
PASS
1.05E-05
PASS
An ISO 9001:2000 Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-04
LATCH Pin Latching Current (A)
8.50E-04
8.00E-04
7.50E-04
7.00E-04
6.50E-04
6.00E-04
5.50E-04
5.00E-04
4.50E-04
4.00E-04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.14. Plot of LATCH Pin Latching Current (A) versus total dose. The data show no significant change
with total dose. The solid diamonds are the average of the measured data points for the samples irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.14. Raw data for LATCH Pin Latching Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
Total Dose (krad(Si))
LATCH Pin Latching Current (A)
0
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
6.00E-04
6.00E-04
10
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
6.00E-04
6.00E-04
20
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
6.00E-04
6.00E-04
168 hr
Anneal
30
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
6.00E-04
6.00E-04
50
6.00E-04
5.50E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
5.50E-04
6.00E-04
60
6.00E-04
5.50E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
5.50E-04
6.00E-04
6.00E-04 6.00E-04 6.00E-04 6.00E-04
0.00E+00 0.00E+00 0.00E+00 0.00E+00
6.00E-04 6.00E-04 6.00E-04 6.00E-04
6.00E-04 6.00E-04 6.00E-04 6.00E-04
5.90E-04
2.24E-05
6.51E-04
5.29E-04
5.90E-04 6.00E-04
2.24E-05 0.00E+00
6.51E-04 6.00E-04
5.29E-04 6.00E-04
6.10E-04 6.10E-04 6.10E-04 6.10E-04 6.00E-04
2.24E-05 2.24E-05 2.24E-05 2.24E-05 3.54E-05
6.71E-04 6.71E-04 6.71E-04 6.71E-04 6.97E-04
5.49E-04 5.49E-04 5.49E-04 5.49E-04 5.03E-04
8.50E-04 8.50E-04 8.50E-04 8.50E-04 8.50E-04
PASS
PASS
PASS
PASS
PASS
6.00E-04 6.10E-04
3.54E-05 2.24E-05
6.97E-04 6.71E-04
5.03E-04 5.49E-04
8.50E-04 8.50E-04
PASS
PASS
An ISO 9001:2000 Certified Company
35
70
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.00E-04
6.50E-04
6.00E-04
6.00E-04
6.00E-04
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
VIN-VOUT Diff Threshold Latch Disable (V)
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.15. Plot of VIN-VOUT Diff Threshold Latch Disable (V) versus total dose. The data show no
significant change with total dose. The solid diamonds are the average of the measured data points for the
samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of
the data points after application of the KTL statistics on the samples irradiated under electrical bias while the
gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Table 5.15. Raw data for VIN-VOUT Diff Threshold Latch Disable (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Device
1
2
3
4
5
6
7
8
9
10
22
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
Total Dose (krad(Si))
VIN-VOUT Diff Threshold Latch Disable (V)
168 hr
Anneal
0
6.09E-01
6.09E-01
6.04E-01
6.09E-01
6.09E-01
6.04E-01
6.04E-01
6.04E-01
6.04E-01
6.06E-01
6.04E-01
10
5.85E-01
5.85E-01
5.85E-01
5.85E-01
5.89E-01
5.85E-01
5.85E-01
5.85E-01
5.85E-01
5.85E-01
5.89E-01
20
5.85E-01
5.80E-01
5.77E-01
5.80E-01
5.85E-01
5.80E-01
5.80E-01
5.80E-01
5.77E-01
5.85E-01
5.90E-01
30
5.79E-01
5.79E-01
5.77E-01
5.79E-01
5.84E-01
5.77E-01
5.77E-01
5.84E-01
5.79E-01
5.84E-01
5.89E-01
50
5.70E-01
5.70E-01
5.70E-01
5.70E-01
5.75E-01
5.70E-01
5.70E-01
5.70E-01
5.70E-01
5.75E-01
5.80E-01
60
5.74E-01
5.74E-01
5.74E-01
5.74E-01
5.79E-01
5.74E-01
5.74E-01
5.74E-01
5.74E-01
5.79E-01
5.84E-01
70
5.74E-01
5.79E-01
5.74E-01
5.79E-01
5.79E-01
5.79E-01
5.79E-01
5.79E-01
5.79E-01
5.79E-01
5.89E-01
6.08E-01
2.24E-03
6.14E-01
6.02E-01
5.86E-01
1.79E-03
5.91E-01
5.81E-01
5.81E-01
3.51E-03
5.91E-01
5.72E-01
5.80E-01
2.61E-03
5.87E-01
5.72E-01
5.71E-01
2.24E-03
5.77E-01
5.65E-01
5.75E-01
2.24E-03
5.81E-01
5.69E-01
5.77E-01
2.74E-03
5.85E-01
5.69E-01
6.04E-01 5.85E-01 5.80E-01 5.80E-01 5.71E-01
8.94E-04 0.00E+00 2.88E-03 3.56E-03 2.24E-03
6.07E-01 5.85E-01 5.88E-01 5.90E-01 5.77E-01
6.02E-01 5.85E-01 5.73E-01 5.70E-01 5.65E-01
5.50E-01 5.00E-01 5.00E-01 5.00E-01 4.80E-01
PASS
PASS
PASS
PASS
PASS
8.00E-01 8.10E-01 8.20E-01 8.20E-01 8.50E-01
PASS
PASS
PASS
PASS
PASS
5.75E-01
2.24E-03
5.81E-01
5.69E-01
4.80E-01
PASS
8.50E-01
PASS
5.79E-01
0.00E+00
5.79E-01
5.79E-01
4.80E-01
PASS
8.50E-01
PASS
An ISO 9001:2000 Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-125 090825 R1.1
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.60E+00
Minimum Bias Voltage (V)
2.40E+00
2.20E+00
2.00E+00
1.80E+00
1.60E+00
1.40E+00
1.20E+00
1.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.16. Plot of Minimum Bias Voltage (V) versus total dose. The data show no significant change with
total dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.16. Raw data for Minimum Bias Voltage (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Minimum Bias Voltage (V)
Device
1
2
3
4
5
6
7
8
9
10
22
0
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
Biased Statistics
Average Biased
1.90E+00
Std Dev Biased
0.00E+00
Ps90%/90% (+KTL) Biased
1.90E+00
Ps90%/90% (-KTL) Biased
1.90E+00
Un-Biased Statistics
Average Un-Biased
1.90E+00
Std Dev Un-Biased
0.00E+00
Ps90%/90% (+KTL) Un-Biased 1.90E+00
Ps90%/90% (-KTL) Un-Biased
1.90E+00
Specification MAX
2.40E+00
Status
PASS
168 hr
Anneal
60
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
70
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
10
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
20
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
30
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
1.90E+00
0.00E+00
1.90E+00
1.90E+00
1.90E+00
0.00E+00
1.90E+00
1.90E+00
1.90E+00 1.83E+00 1.90E+00 1.90E+00
0.00E+00 9.75E-02 0.00E+00 0.00E+00
1.90E+00 2.10E+00 1.90E+00 1.90E+00
1.90E+00 1.56E+00 1.90E+00 1.90E+00
1.90E+00
0.00E+00
1.90E+00
1.90E+00
2.40E+00
PASS
1.90E+00
0.00E+00
1.90E+00
1.90E+00
2.40E+00
PASS
1.90E+00
0.00E+00
1.90E+00
1.90E+00
2.40E+00
PASS
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50
1.75E+00
1.70E+00
1.90E+00
1.90E+00
1.90E+00
1.70E+00
1.90E+00
1.90E+00
1.75E+00
1.90E+00
1.90E+00
24 hr
Anneal
1.83E+00
9.75E-02
2.10E+00
1.56E+00
2.40E+00
PASS
1.90E+00
0.00E+00
1.90E+00
1.90E+00
2.40E+00
PASS
1.90E+00
0.00E+00
1.90E+00
1.90E+00
2.40E+00
PASS
ELDRS Report
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Radiation Assured Devices
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(719) 531-0800
6.0. Summary / Conclusions
The low dose rate total ionizing dose testing described in this final report was performed using the
facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. For the low
dose rate ELDRS testing described in this report, the devices were placed approximately 2-meters from
the Co-60 rods to achieve the required 10mrad(Si)/s dose rate. Samples of the RH1573MJ8 low dropout
PNP regulator driver described in this report were irradiated biased with a single 7V VIN and unbiased
(all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level of
50krad(Si) with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si).
Electrical testing occurred within one hour following the end of each irradiation segment. For
intermediate irradiations, the units were tested and returned to total dose exposure within two hours from
the end of the previous radiation increment. In addition, all units-under-test received a 24hr room
temperature and 168hr 100°C anneal, using the same bias conditions as the radiation exposure.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
were presented in this report. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 99/90 and a 5-piece sample size. Note that the following criteria was used to
determine the outcome of the testing: following the radiation exposure each parameter had to pass the
specification value and the average value for the ten-piece sample must pass the specification value
when the KTL limits are applied. If these conditions were not both satisfied following the radiation
exposure, then the lot would be logged as an RLAT failure.
Using the conditions stated above, the RH1573MJ8 devices passed the ELDRS test to 50krad(Si) with
no significant degradation to most of the measured parameters. Where radiation induced degradation
was observed the degradation was not sufficient to cause the parameter to exceed the specification value.
Note that VREF exceeded the upper datasheet specification after application of the 90/90 KTL statistics
due to the relative large standard deviation of the sample population compared to the very tight
specification limits. In our opinion this lot of material could be qualified to 50krad(Si) using larger
samples sizes and an “attributes” approach, i.e. 22 units passing with 0 failures.
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Appendix A: Photograph of device-under-test to show part markings
Note: RH1573K DICE is assembled in CERDIP-8 package for testing purposes.
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Appendix B: Radiation Bias Connections
Biased Samples:
Pin
Function
Connection / Bias
1
FB
GND
2
LATCH
GND
3
SHDN
GND
4
GND
GND
5
DRIVE
To Pin 6 via 340Ω Resistor
6
VIN
To 7V using 1μF decoupling, to Pin 5 via 340Ω Resistor
7
VOUT
NC
8
COMP
NC
Unbiased Samples:
Pin
Function
Connection / Bias
1
FB
GND
2
LATCH
GND
3
SHDN
GND
4
GND
GND
5
DRIVE
GND
6
VIN
GND
7
VOUT
GND
8
COMP
GND
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Figure B.1. Irradiation bias circuit for the units to be irradiated under electrical bias. This figure was
extracted from LINEAR TECHNOLOGY CORPORATION, RH1573K Drawing number 05-08-5223.
Figure B.2. Package drawing (for reference only). This figure was extracted from LINEAR
TECHNOLOGY CORPORATION, RH1573K Drawing number 05-08-5223.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2510 Digital Family Board, and
the RH1573/LT1573 BGSS-080908 DUT board. The measured parameters and test conditions are
shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Tables C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1573MJ8
TEST
DESCRIPTION
TEST
CONDITIONS
VIN=7V
Input Quiescent Current (A)
IDRIVE=20mA
Reference Voltage (V)
IDRIVE=20mA, VIN=3V-7V
Line Regulation (V)
IDRIVE=20mA-250mA
Load Regulation (V)
VFB=1.265V
FB Pin Bias Current (A)
VFB=1.35V, VDRIVE=7V
DRIVE Pin Current VFB=1.35V (A)
VFB=1.15V, VDRIVE=1.5V
DRIVE Pin Current VFB=1.15V (A)
IDRIVE=20mA, VFB=1.15V
DRIVE Pin Saturation Voltage ID=20mA (V)
DRIVE Pin Saturation Voltage ID=250mA (V) IDRIVE=250mA, VFB=1.15V
IDRIVE=20mA, VIN=5V
SHDN Pin Threshold Voltage (V)
VSHDN=5V
SHDN Pin Current (A)
IDRIVE=20mA, VIN=5V
LATCH Pin Latch-Off Threshold Voltage (V)
LATCH Pin Charging Current (A)
LATCH Pin Latching Current (A)
VIN-VOUT Diff Threshold Latch Disable (V)
Minimum Bias Voltage (V)
VIN=5V
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Table C.2 Measured parameters, pre-irradiation specifications and measurement resolutions
for the RH1573MJ8
Pre-Irradiation
Measurement
Specification Resolution/Precision
Input Quiescent Current (A)
2.8mA MAX
± 4.22E-06A
Reference Voltage (V)
1.252V-1.278V
± 8.71E-04V
Line Regulation (V)
2mV MAX
± 3.06E-04V
Load Regulation (V)
18mV MAX
± 1.12E-03V
FB Pin Bias Current (A)
4µA MAX
± 1.12E-08A
DRIVE Pin Current VFB=1.35V (A)
1.2mA MAX
± 9.97E-07A
DRIVE Pin Current VFB=1.15V (A)
290mA MIN
± 6.65E-04A
DRIVE Pin Saturation Voltage ID=20mA (V)
0.2V MAX
± 6.53E-04V
DRIVE Pin Saturation Voltage ID=250mA (V)
1V MAX
± 2.23E-03V
SHDN Pin Threshold Voltage (V)
1V-1.5V
± 1.00E-03V
SHDN Pin Current (A)
300µA MAX
± 2.61E-07A
LATCH Pin Latch-Off Threshold Voltage (V)
1.1V-1.8V
± 8.43E-03V
LATCH Pin Charging Current (A)
4µA-10µA
± 2.06E-08A
LATCH Pin Latching Current (A)
0.85mA MAX
± 5.00E-05A
VIN-VOUT Diff Threshold Latch Disable (V)
0.55V-0.8V
± 1.96E-03V
Minimum Bias Voltage (V)
2.4V MIN
± 1.00E-03V
Measured Parameter
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Appendix D: List of Figures Used in Section 5 (ELDRS Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
Input Quiescent Current (A)
Reference Voltage (V)
Line Regulation (V)
Load Regulation (V)
FB Pin Bias Current (A)
DRIVE Pin Current VFB=1.35V (A)
DRIVE Pin Current VFB=1.15V (A)
DRIVE Pin Saturation Voltage ID=20mA (V)
DRIVE Pin Saturation Voltage ID=250mA (V)
SHDN Pin Threshold Voltage (V)
SHDN Pin Current (A)
LATCH Pin Latch-Off Threshold Voltage (V)
LATCH Pin Charging Current (A)
LATCH Pin Latching Current (A)
VIN-VOUT Diff Threshold Latch Disable (V)
Minimum Bias Voltage (V)
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