ELDRS Report_RH1498MW_Fab Lot W10739896 1.pdf

ELDRS Report
09-579 100408 R1.0
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1498MW Dual Precision Op Amp for Linear Technology
Customer: Linear Technology (PO# 54873L)
RAD Job Number: 09-579
Part Type Tested: Linear Technology RH1498MW Dual Precision Op Amp
Commercial Part Number: RH1498MW
Traceability Information: Lot Date Code: 0931A, Assy Lot# 533036.1, Fab Lot# W10739896.1, Wafer 9
(Obtained from Linear Technology PO 54873L). See photograph of unit under test in Appendix A.
Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 control
units. Serial numbers 45-47, 60, and 61 were biased during irradiation, serial numbers 62-65, and 77 were
unbiased during irradiation and serial numbers 99 and 100 were used as controls. See Appendix B for the
radiation bias connection table.
External Traveler: None Required
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1498 DUT Board
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5
Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C ± 6°C
per MIL-STD-883.
Low Dose Rate Test Result: PASSED. Units Passed to 50krad(Si) with all
parameters remaining within their pre- and/or post-radiation specification limits.
Further the units do not exhibit ELDRS as defined in the current test method.
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the
device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from
approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4meters.
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3.0. Radiation Test Conditions
The RH1498MW Dual Precision Op Amp described in this final report was tested using two bias
conditions, biased with a split 15V supply and all pins tied to ground, see Appendix B for details on
biasing conditions. These bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section
3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to
produce the greatest radiation induced damage or the worst-case damage for the intended application, if
known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input
bias current or maximum output load current) exhibit more degradation with 0 V bias.”
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of
each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose
exposure within two hours from the end of the previous radiation increment. The TID bias board was
positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a
lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7
Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed
in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered radiation. A
minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al
container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The
radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is
changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed.
This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation
container at the approximate test-device position. If it can be demonstrated that low energy scattered
radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al
container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10mrad(Si)/s with a precision of ±5%.
4.0. Tested Parameters
The following parameters were tested during the course of this work:
Measured parameters and test conditions for VS=±15V:
1.
2.
3.
4.
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-2)
Input Offset Current (Op Amp 1-2)
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5. + Input Bias Current (Op Amp 1-2)
6. - Input Bias Current (Op Amp 1-2)
7. Input Offset Voltage (Op Amp 1-2)
8. Input Offset Current (Op Amp 1-2)
9. + Input Bias Current (Op Amp 1-2)
10. - Input Bias Current (Op Amp 1-2)
11. Input Offset Voltage (Op Amp 1-2)
12. Input Offset Current (Op Amp 1-2)
13. + Input Bias Current (Op Amp 1-2)
14. - Input Bias Current (Op Amp 1-2)
15. Large Signal Voltage Gain (Op Amp 1-2)
16. Large Signal Voltage Gain (Op Amp 1-2)
17. CMRR (Op Amp 1-2)
18. CMRR Matching
19. PSRR (Op Amp 1-2)
20. PSRR Matching
21. Output Voltage Swing High (Op Amp 1-2)
22. Output Voltage Swing High (Op Amp 1-2)
23. Output Voltage Swing High (Op Amp 1-2)
24. Output Voltage Swing Low (Op Amp 1-2)
25. Output Voltage Swing Low (Op Amp 1-2)
26. Output Voltage Swing Low (Op Amp 1-2)
27. +VS Short-Circuit Current (Op Amp 1-2)
28. -VS Short-Circuit Current (Op Amp 1-2)
Measured parameters and test conditions for VS=5V:
29. Positive Supply Current
30. Negative Supply Current
31. Input Offset Voltage (VCM=0)
32. Input Offset Voltage (VCM=5)
33. Input Offset Current (VCM=0)
34. Input Offset Current (VCM=5)
35. + Input Bias Current (VCM=0)
36. + Input Bias Current (VCM=5)
37. - Input Bias Current (VCM=0)
38. - Input Bias Current (VCM=5)
39. Large Signal Voltage Gain (10kΩ Load)
40. Common Mode Rejection Ratio
41. Common Mode Rejection Ratio Matching
42. Power Supply Rejection Ratio
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ELDRS Report
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43. Power Supply Rejection Ratio Matching
44. Output Voltage Swing High (No Load)
45. Output Voltage Swing High (ISINK=1mA)
46. Output Voltage Swing High (ISINK=2.5mA)
47. Output Voltage Swing Low (No Load)
48. Output Voltage Swing Low (ISINK=1mA)
49. Output Voltage Swing Low (ISINK=2.5mA)
50. +VS Short Circuit Current
51. -VS Short Circuit Current
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per
MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated
under electrical bias shall pass the specification value. The units irradiated without electrical bias and
the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under
electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
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does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the low dose rate report titled “Total
Ionizing Dose (TID) Testing of the RH1498MW Dual Precision Op Amp for Linear Technology” to
demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1498MW Dual Precision Op Amp (from the lot date code
identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to
50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits.
Note that the data for the units-under-test irradiated in the unbiased condition and the KTL statistics
presented in this report are for reference only and are not used for the determination of “PASS/FAIL”
for the lot.
Figures 5.1 through 5.94 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 – 5.94 show the corresponding raw data for each of these parameters. In these data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change
during the anneal.
As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even
after application of the KTL statistics and the control units, as expected, show no significant changes to
any of the parameters throughout the course of the measurements. Therefore we can conclude that the
observed degradation was due to the radiation exposure and not drift in the test equipment.
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-03
Positive Supply Current (A)
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.1. Plot of Positive Supply Current (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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Table 5.1. Raw data for Positive Supply Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
0
3.81E-03
3.83E-03
3.51E-03
3.86E-03
3.79E-03
3.58E-03
3.70E-03
3.82E-03
3.80E-03
3.71E-03
3.76E-03
3.62E-03
10
3.80E-03
3.81E-03
3.49E-03
3.84E-03
3.77E-03
3.58E-03
3.70E-03
3.82E-03
3.80E-03
3.70E-03
3.76E-03
3.62E-03
20
3.79E-03
3.81E-03
3.49E-03
3.84E-03
3.77E-03
3.58E-03
3.70E-03
3.82E-03
3.82E-03
3.70E-03
3.78E-03
3.64E-03
30
3.80E-03
3.81E-03
3.49E-03
3.84E-03
3.77E-03
3.58E-03
3.71E-03
3.83E-03
3.81E-03
3.70E-03
3.79E-03
3.65E-03
50
3.78E-03
3.80E-03
3.47E-03
3.83E-03
3.75E-03
3.57E-03
3.70E-03
3.82E-03
3.81E-03
3.69E-03
3.79E-03
3.65E-03
24-hr
Anneal
168-hr
Anneal
60
3.78E-03
3.80E-03
3.47E-03
3.83E-03
3.75E-03
3.58E-03
3.70E-03
3.82E-03
3.81E-03
3.69E-03
3.79E-03
3.65E-03
70
3.79E-03
3.80E-03
3.48E-03
3.84E-03
3.76E-03
3.59E-03
3.71E-03
3.83E-03
3.81E-03
3.71E-03
3.79E-03
3.65E-03
Biased Statistics
Average Biased
3.76E-03
3.74E-03
3.74E-03
3.74E-03
3.73E-03
3.73E-03
3.73E-03
Std Dev Biased
1.42E-04
1.43E-04
1.42E-04
1.43E-04
1.46E-04
1.46E-04
1.45E-04
Ps90%/90% (+KTL) Biased
4.15E-03
4.13E-03
4.13E-03
4.13E-03
4.13E-03
4.13E-03
4.13E-03
Ps90%/90% (-KTL) Biased
3.37E-03
3.35E-03
3.35E-03
3.35E-03
3.33E-03
3.33E-03
3.34E-03
Un-Biased Statistics
Average Un-Biased
3.72E-03
3.72E-03
3.72E-03
3.73E-03
3.72E-03
3.72E-03
3.73E-03
Std Dev Un-Biased
9.55E-05
9.59E-05
1.00E-04
1.00E-04
1.02E-04
9.87E-05
9.59E-05
Ps90%/90% (+KTL) Un-Biased
3.98E-03
3.98E-03
4.00E-03
4.00E-03
4.00E-03
3.99E-03
3.99E-03
Ps90%/90% (-KTL) Un-Biased
3.46E-03
3.46E-03
3.45E-03
3.45E-03
3.44E-03
3.45E-03
3.47E-03
Specification MAX
5.00E-03
5.00E-03
5.00E-03
5.00E-03
5.00E-03
5.00E-03
5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
0.00E+00
Negative Supply Current (A)
-1.00E-03
-2.00E-03
-3.00E-03
-4.00E-03
-5.00E-03
-6.00E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.2. Plot of Negative Supply Current (A) versus total dose. The solid diamonds are the average of the
measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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Table 5.2. Raw data for Negative Supply Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
0
-3.82E-03
-3.84E-03
-3.52E-03
-3.87E-03
-3.80E-03
-3.59E-03
-3.71E-03
-3.84E-03
-3.81E-03
-3.71E-03
-3.77E-03
-3.63E-03
10
-3.80E-03
-3.82E-03
-3.50E-03
-3.85E-03
-3.78E-03
-3.58E-03
-3.71E-03
-3.82E-03
-3.81E-03
-3.71E-03
-3.77E-03
-3.63E-03
20
-3.80E-03
-3.82E-03
-3.50E-03
-3.85E-03
-3.78E-03
-3.59E-03
-3.71E-03
-3.83E-03
-3.83E-03
-3.71E-03
-3.79E-03
-3.65E-03
30
-3.81E-03
-3.82E-03
-3.50E-03
-3.85E-03
-3.78E-03
-3.60E-03
-3.72E-03
-3.84E-03
-3.82E-03
-3.71E-03
-3.80E-03
-3.66E-03
50
-3.79E-03
-3.81E-03
-3.48E-03
-3.84E-03
-3.76E-03
-3.58E-03
-3.71E-03
-3.82E-03
-3.81E-03
-3.70E-03
-3.80E-03
-3.66E-03
24-hr
Anneal
168-hr
Anneal
60
-3.79E-03
-3.80E-03
-3.48E-03
-3.83E-03
-3.76E-03
-3.59E-03
-3.71E-03
-3.82E-03
-3.81E-03
-3.70E-03
-3.80E-03
-3.66E-03
70
-3.79E-03
-3.81E-03
-3.49E-03
-3.85E-03
-3.76E-03
-3.60E-03
-3.72E-03
-3.84E-03
-3.82E-03
-3.72E-03
-3.80E-03
-3.66E-03
Biased Statistics
Average Biased
-3.77E-03 -3.75E-03 -3.75E-03 -3.75E-03 -3.74E-03 -3.73E-03 -3.74E-03
Std Dev Biased
1.42E-04
1.42E-04
1.42E-04
1.43E-04
1.46E-04
1.43E-04
1.44E-04
Ps90%/90% (+KTL) Biased
-3.38E-03 -3.36E-03 -3.36E-03 -3.36E-03 -3.34E-03 -3.34E-03 -3.35E-03
Ps90%/90% (-KTL) Biased
-4.16E-03 -4.14E-03 -4.14E-03 -4.14E-03 -4.14E-03 -4.12E-03 -4.13E-03
Un-Biased Statistics
Average Un-Biased
-3.73E-03 -3.73E-03 -3.73E-03 -3.74E-03 -3.72E-03 -3.73E-03 -3.74E-03
Std Dev Un-Biased
9.86E-05
9.71E-05
1.00E-04
9.65E-05
9.76E-05
9.40E-05
9.59E-05
Ps90%/90% (+KTL) Un-Biased
-3.46E-03 -3.46E-03 -3.46E-03 -3.47E-03 -3.46E-03 -3.47E-03 -3.48E-03
Ps90%/90% (-KTL) Un-Biased
-4.00E-03 -3.99E-03 -4.01E-03 -4.00E-03 -3.99E-03 -3.98E-03 -4.00E-03
Specification MIN
-5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
11
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.3. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
12
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.3. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.16E-05
1.37E-04
-4.71E-05
-4.29E-05
-2.23E-04
-9.60E-05
-1.24E-05
4.09E-05
8.04E-05
1.73E-04
-6.65E-05
-2.20E-04
10
-5.80E-06
1.02E-04
-6.86E-05
-7.37E-05
-2.50E-04
-1.04E-04
-3.03E-05
2.27E-05
6.65E-05
1.62E-04
-6.73E-05
-2.18E-04
20
4.82E-06
1.13E-04
-6.29E-05
-6.59E-05
-2.37E-04
-1.02E-04
-3.01E-05
2.57E-05
7.22E-05
1.71E-04
-6.62E-05
-2.19E-04
30
8.93E-06
1.17E-04
-4.83E-05
-6.27E-05
-2.33E-04
-9.72E-05
-3.00E-05
3.04E-05
7.15E-05
1.74E-04
-6.36E-05
-2.17E-04
50
1.11E-05
1.19E-04
-4.49E-05
-6.21E-05
-2.42E-04
-9.87E-05
-3.13E-05
2.93E-05
7.18E-05
1.79E-04
-6.26E-05
-2.22E-04
60
1.03E-05
1.19E-04
-4.54E-05
-6.07E-05
-2.41E-04
-9.77E-05
-3.07E-05
2.58E-05
7.23E-05
1.78E-04
-6.17E-05
-2.23E-04
70
3.45E-05
9.88E-05
-7.43E-05
-7.15E-05
-2.34E-04
-9.15E-05
-2.30E-05
1.56E-06
6.00E-05
1.47E-04
-6.34E-05
-2.22E-04
-3.29E-05
1.30E-04
3.23E-04
-3.89E-04
-5.92E-05
1.28E-04
2.92E-04
-4.10E-04
-4.95E-05
1.28E-04
3.00E-04
-3.99E-04
-4.37E-05
1.27E-04
3.05E-04
-3.93E-04
-4.38E-05
1.31E-04
3.16E-04
-4.04E-04
-4.36E-05
1.31E-04
3.15E-04
-4.03E-04
-4.94E-05
1.27E-04
2.98E-04
-3.97E-04
3.72E-05
2.33E-05
2.74E-05
2.97E-05
3.01E-05
2.96E-05
1.87E-05
1.01E-04
1.00E-04
1.03E-04
1.03E-04
1.05E-04
1.05E-04
8.98E-05
3.13E-04
2.98E-04
3.10E-04
3.11E-04
3.19E-04
3.17E-04
2.65E-04
-2.39E-04 -2.51E-04 -2.55E-04 -2.52E-04 -2.59E-04 -2.57E-04 -2.27E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.4. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.4. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.77E-04
-5.60E-05
-1.09E-04
-1.89E-04
-3.32E-04
2.38E-05
3.61E-05
-1.11E-04
-3.92E-04
5.73E-05
4.95E-05
7.22E-05
10
1.55E-04
-7.41E-05
-1.52E-04
-2.19E-04
-3.64E-04
1.48E-05
2.14E-05
-1.00E-04
-4.03E-04
4.47E-05
5.01E-05
7.27E-05
20
1.61E-04
-6.67E-05
-1.49E-04
-2.12E-04
-3.43E-04
1.51E-05
2.44E-05
-7.54E-05
-4.01E-04
5.02E-05
5.23E-05
8.40E-05
30
1.65E-04
-6.33E-05
-1.49E-04
-2.10E-04
-3.46E-04
1.41E-05
2.62E-05
-4.52E-05
-4.06E-04
5.24E-05
5.36E-05
8.58E-05
50
1.65E-04
-6.09E-05
-1.53E-04
-2.06E-04
-3.43E-04
1.62E-05
2.31E-05
-1.22E-06
-4.04E-04
5.32E-05
5.20E-05
7.53E-05
60
1.65E-04
-6.15E-05
-1.53E-04
-2.06E-04
-3.43E-04
1.73E-05
2.21E-05
-5.08E-06
-4.03E-04
5.38E-05
5.08E-05
7.62E-05
70
1.50E-04
-7.84E-05
-1.87E-04
-1.87E-04
-3.56E-04
-1.04E-05
1.33E-05
-1.05E-04
-4.03E-04
1.28E-05
5.26E-05
7.53E-05
-1.02E-04
1.87E-04
4.12E-04
-6.16E-04
-1.31E-04
1.92E-04
3.95E-04
-6.57E-04
-1.22E-04
1.88E-04
3.93E-04
-6.36E-04
-1.21E-04
1.90E-04
4.00E-04
-6.42E-04
-1.20E-04
1.89E-04
3.99E-04
-6.38E-04
-1.20E-04
1.89E-04
3.98E-04
-6.37E-04
-1.32E-04
1.86E-04
3.79E-04
-6.42E-04
-7.71E-05 -8.45E-05 -7.74E-05 -7.17E-05 -6.25E-05 -6.31E-05 -9.85E-05
1.88E-04
1.87E-04
1.87E-04
1.90E-04
1.92E-04
1.91E-04
1.77E-04
4.39E-04
4.28E-04
4.36E-04
4.50E-04
4.63E-04
4.62E-04
3.87E-04
-5.93E-04 -5.97E-04 -5.90E-04 -5.93E-04 -5.88E-04 -5.88E-04 -5.84E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 0 V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.5. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.5. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 0 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
4.41E-09
-3.04E-09
4.13E-09
-2.19E-09
-6.00E-11
1.17E-08
-7.99E-10
1.04E-09
2.53E-09
2.21E-09
5.71E-10
-7.15E-09
10
4.46E-09
-3.63E-09
3.75E-09
-2.65E-09
-1.27E-10
1.10E-08
-1.27E-09
1.20E-09
2.59E-09
1.90E-09
5.56E-10
-7.16E-09
20
4.53E-09
-3.35E-09
3.89E-09
-2.31E-09
-6.37E-10
1.10E-08
-1.72E-09
1.71E-09
3.13E-09
1.81E-09
5.74E-10
-6.93E-09
30
4.38E-09
-3.41E-09
3.80E-09
-2.20E-09
-7.42E-10
1.04E-08
-1.72E-09
2.05E-09
3.48E-09
1.59E-09
4.92E-10
-6.78E-09
50
4.07E-09
-3.29E-09
4.20E-09
-2.49E-09
-7.82E-10
9.99E-09
-2.13E-09
2.35E-09
3.68E-09
2.48E-09
5.36E-10
-6.75E-09
60
4.24E-09
-3.17E-09
4.28E-09
-2.46E-09
-5.93E-10
1.01E-08
-2.09E-09
2.11E-09
3.70E-09
2.07E-09
5.24E-10
-6.73E-09
70
4.45E-09
-3.62E-09
3.66E-09
-2.29E-09
-6.50E-11
1.04E-08
-1.16E-09
1.19E-09
3.15E-09
2.29E-09
5.17E-10
-6.72E-09
6.49E-10
3.48E-09
1.02E-08
-8.89E-09
3.62E-10
3.66E-09
1.04E-08
-9.67E-09
4.24E-10
3.60E-09
1.03E-08
-9.44E-09
3.65E-10
3.53E-09
1.01E-08
-9.32E-09
3.40E-10
3.58E-09
1.02E-08
-9.48E-09
4.60E-10
3.59E-09
1.03E-08
-9.40E-09
4.26E-10
3.56E-09
1.02E-08
-9.32E-09
3.33E-09
3.09E-09
3.18E-09
3.16E-09
3.27E-09
3.18E-09
3.18E-09
4.85E-09
4.67E-09
4.72E-09
4.48E-09
4.36E-09
4.44E-09
4.36E-09
1.66E-08
1.59E-08
1.61E-08
1.54E-08
1.52E-08
1.54E-08
1.51E-08
-9.96E-09 -9.71E-09 -9.75E-09 -9.12E-09 -8.67E-09 -8.99E-09 -8.77E-09
-7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.00E-08
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 0 V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.6. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.6. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 0 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.90E-11
4.82E-09
-1.44E-09
1.58E-09
-1.35E-09
2.02E-09
-2.80E-09
4.92E-09
-9.12E-09
1.51E-09
2.05E-10
-7.45E-10
10
1.58E-10
5.08E-09
-1.64E-09
1.43E-09
-1.64E-09
1.87E-09
-3.48E-09
5.16E-09
-9.03E-09
1.92E-09
2.09E-10
-7.28E-10
20
-2.43E-10
5.19E-09
-1.95E-09
1.73E-09
-1.28E-09
2.56E-09
-3.10E-09
5.31E-09
-8.58E-09
3.04E-09
2.65E-10
-6.57E-10
30
3.33E-10
4.88E-09
-2.12E-09
1.60E-09
-1.70E-09
2.22E-09
-2.93E-09
4.78E-09
-8.46E-09
3.46E-09
1.56E-10
-6.59E-10
50
-9.24E-10
4.82E-09
-2.85E-09
1.94E-09
-1.72E-09
3.03E-09
-2.55E-09
5.62E-09
-8.15E-09
4.04E-09
1.96E-10
-7.51E-10
60
-8.09E-10
5.02E-09
-2.77E-09
1.74E-09
-1.67E-09
3.07E-09
-2.72E-09
5.30E-09
-8.57E-09
4.28E-09
1.90E-10
-8.02E-10
70
2.13E-10
5.08E-09
-2.24E-09
2.10E-09
-1.43E-09
2.29E-09
-2.45E-09
4.49E-09
-8.69E-09
2.99E-09
1.95E-10
-7.32E-10
7.28E-10
2.60E-09
7.85E-09
-6.40E-09
6.79E-10
2.78E-09
8.31E-09
-6.95E-09
6.87E-10
2.87E-09
8.57E-09
-7.20E-09
5.98E-10
2.83E-09
8.37E-09
-7.17E-09
2.52E-10
3.11E-09
8.77E-09
-8.27E-09
3.03E-10
3.12E-09
8.86E-09
-8.25E-09
7.44E-10
2.94E-09
8.80E-09
-7.31E-09
-6.94E-10 -7.14E-10 -1.54E-10 -1.85E-10
3.99E-10
2.70E-10 -2.74E-10
5.46E-09
5.59E-09
5.64E-09
5.47E-09
5.68E-09
5.84E-09
5.37E-09
1.43E-08
1.46E-08
1.53E-08
1.48E-08
1.60E-08
1.63E-08
1.45E-08
-1.57E-08 -1.60E-08 -1.56E-08 -1.52E-08 -1.52E-08 -1.57E-08 -1.50E-08
-7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.00E-08
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 0 V #1
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.7. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.7. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-2.54E-07
-2.29E-07
-2.31E-07
-2.69E-07
-2.71E-07
-2.19E-07
-2.52E-07
-2.66E-07
-2.42E-07
-2.61E-07
-2.32E-07
-2.42E-07
10
-2.57E-07
-2.33E-07
-2.35E-07
-2.74E-07
-2.76E-07
-2.29E-07
-2.63E-07
-2.77E-07
-2.52E-07
-2.74E-07
-2.31E-07
-2.42E-07
20
-2.61E-07
-2.36E-07
-2.37E-07
-2.77E-07
-2.79E-07
-2.34E-07
-2.68E-07
-2.83E-07
-2.55E-07
-2.80E-07
-2.30E-07
-2.40E-07
30
-2.62E-07
-2.37E-07
-2.38E-07
-2.78E-07
-2.81E-07
-2.39E-07
-2.72E-07
-2.89E-07
-2.62E-07
-2.86E-07
-2.28E-07
-2.39E-07
50
-2.68E-07
-2.42E-07
-2.41E-07
-2.85E-07
-2.87E-07
-2.49E-07
-2.83E-07
-3.02E-07
-2.72E-07
-2.99E-07
-2.28E-07
-2.39E-07
60
-2.68E-07
-2.43E-07
-2.41E-07
-2.85E-07
-2.87E-07
-2.48E-07
-2.82E-07
-3.01E-07
-2.71E-07
-2.98E-07
-2.28E-07
-2.38E-07
70
-2.63E-07
-2.38E-07
-2.37E-07
-2.79E-07
-2.81E-07
-2.32E-07
-2.65E-07
-2.80E-07
-2.54E-07
-2.76E-07
-2.28E-07
-2.38E-07
-2.51E-07
2.02E-08
-1.95E-07
-3.06E-07
-2.55E-07
2.06E-08
-1.99E-07
-3.12E-07
-2.58E-07
2.09E-08
-2.00E-07
-3.15E-07
-2.59E-07
2.11E-08
-2.01E-07
-3.17E-07
-2.65E-07
2.22E-08
-2.04E-07
-3.25E-07
-2.65E-07
2.21E-08
-2.04E-07
-3.25E-07
-2.59E-07
2.14E-08
-2.01E-07
-3.18E-07
-2.48E-07 -2.59E-07 -2.64E-07 -2.70E-07 -2.81E-07 -2.80E-07 -2.61E-07
1.87E-08
1.95E-08
2.01E-08
2.05E-08
2.15E-08
2.16E-08
1.94E-08
-1.96E-07 -2.06E-07 -2.09E-07 -2.13E-07 -2.22E-07 -2.21E-07 -2.08E-07
-2.99E-07 -3.12E-07 -3.19E-07 -3.26E-07 -3.40E-07 -3.39E-07 -3.15E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 0 V #2
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.8. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.8. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-2.52E-07
-2.14E-07
-2.28E-07
-2.68E-07
-2.70E-07
-2.15E-07
-2.54E-07
-2.68E-07
-2.52E-07
-2.59E-07
-2.40E-07
-2.38E-07
10
-2.56E-07
-2.18E-07
-2.32E-07
-2.72E-07
-2.75E-07
-2.25E-07
-2.64E-07
-2.81E-07
-2.62E-07
-2.72E-07
-2.39E-07
-2.37E-07
20
-2.60E-07
-2.21E-07
-2.34E-07
-2.75E-07
-2.78E-07
-2.30E-07
-2.69E-07
-2.89E-07
-2.65E-07
-2.77E-07
-2.37E-07
-2.36E-07
30
-2.61E-07
-2.22E-07
-2.35E-07
-2.76E-07
-2.80E-07
-2.34E-07
-2.73E-07
-2.96E-07
-2.71E-07
-2.83E-07
-2.36E-07
-2.35E-07
50
-2.67E-07
-2.28E-07
-2.39E-07
-2.82E-07
-2.87E-07
-2.44E-07
-2.84E-07
-3.13E-07
-2.81E-07
-2.95E-07
-2.36E-07
-2.35E-07
60
-2.67E-07
-2.28E-07
-2.39E-07
-2.82E-07
-2.87E-07
-2.43E-07
-2.83E-07
-3.12E-07
-2.81E-07
-2.93E-07
-2.36E-07
-2.34E-07
70
-2.61E-07
-2.23E-07
-2.35E-07
-2.77E-07
-2.80E-07
-2.27E-07
-2.66E-07
-2.86E-07
-2.64E-07
-2.73E-07
-2.36E-07
-2.34E-07
-2.46E-07
2.48E-08
-1.78E-07
-3.14E-07
-2.51E-07
2.51E-08
-1.82E-07
-3.19E-07
-2.53E-07
2.52E-08
-1.84E-07
-3.22E-07
-2.55E-07
2.54E-08
-1.85E-07
-3.24E-07
-2.61E-07
2.60E-08
-1.89E-07
-3.32E-07
-2.61E-07
2.61E-08
-1.89E-07
-3.32E-07
-2.55E-07
2.56E-08
-1.85E-07
-3.25E-07
-2.50E-07 -2.61E-07 -2.66E-07 -2.71E-07 -2.83E-07 -2.82E-07 -2.63E-07
2.03E-08
2.11E-08
2.21E-08
2.31E-08
2.55E-08
2.52E-08
2.19E-08
-1.94E-07 -2.03E-07 -2.06E-07 -2.08E-07 -2.14E-07 -2.13E-07 -2.03E-07
-3.05E-07 -3.19E-07 -3.26E-07 -3.35E-07 -3.53E-07 -3.51E-07 -3.24E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 0 V #1
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.9. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.9. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-2.58E-07
-2.25E-07
-2.35E-07
-2.66E-07
-2.71E-07
-2.30E-07
-2.51E-07
-2.67E-07
-2.44E-07
-2.63E-07
-2.32E-07
-2.35E-07
10
-2.62E-07
-2.29E-07
-2.38E-07
-2.71E-07
-2.76E-07
-2.40E-07
-2.61E-07
-2.78E-07
-2.54E-07
-2.76E-07
-2.32E-07
-2.34E-07
20
-2.65E-07
-2.32E-07
-2.40E-07
-2.74E-07
-2.78E-07
-2.45E-07
-2.66E-07
-2.85E-07
-2.58E-07
-2.82E-07
-2.30E-07
-2.33E-07
30
-2.66E-07
-2.33E-07
-2.41E-07
-2.75E-07
-2.80E-07
-2.49E-07
-2.70E-07
-2.90E-07
-2.65E-07
-2.88E-07
-2.29E-07
-2.32E-07
50
-2.72E-07
-2.39E-07
-2.45E-07
-2.82E-07
-2.86E-07
-2.59E-07
-2.81E-07
-3.04E-07
-2.76E-07
-3.01E-07
-2.29E-07
-2.32E-07
60
-2.72E-07
-2.39E-07
-2.45E-07
-2.81E-07
-2.86E-07
-2.58E-07
-2.80E-07
-3.03E-07
-2.74E-07
-3.00E-07
-2.29E-07
-2.31E-07
70
-2.67E-07
-2.34E-07
-2.41E-07
-2.76E-07
-2.81E-07
-2.42E-07
-2.63E-07
-2.81E-07
-2.57E-07
-2.78E-07
-2.28E-07
-2.31E-07
-2.51E-07
2.01E-08
-1.96E-07
-3.06E-07
-2.55E-07
2.05E-08
-1.99E-07
-3.11E-07
-2.58E-07
2.05E-08
-2.02E-07
-3.14E-07
-2.59E-07
2.08E-08
-2.02E-07
-3.16E-07
-2.65E-07
2.16E-08
-2.06E-07
-3.24E-07
-2.65E-07
2.14E-08
-2.06E-07
-3.24E-07
-2.60E-07
2.12E-08
-2.01E-07
-3.18E-07
-2.51E-07 -2.62E-07 -2.67E-07 -2.72E-07 -2.84E-07 -2.83E-07 -2.64E-07
1.47E-08
1.56E-08
1.66E-08
1.72E-08
1.87E-08
1.85E-08
1.60E-08
-2.10E-07 -2.19E-07 -2.22E-07 -2.25E-07 -2.33E-07 -2.32E-07 -2.20E-07
-2.91E-07 -3.05E-07 -3.13E-07 -3.20E-07 -3.35E-07 -3.34E-07 -3.08E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 0 V #2
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.10. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-2.52E-07
-2.19E-07
-2.26E-07
-2.69E-07
-2.68E-07
-2.17E-07
-2.51E-07
-2.72E-07
-2.42E-07
-2.61E-07
-2.40E-07
-2.37E-07
10
-2.56E-07
-2.23E-07
-2.30E-07
-2.74E-07
-2.73E-07
-2.27E-07
-2.61E-07
-2.86E-07
-2.52E-07
-2.73E-07
-2.39E-07
-2.37E-07
20
-2.59E-07
-2.26E-07
-2.32E-07
-2.76E-07
-2.76E-07
-2.32E-07
-2.66E-07
-2.94E-07
-2.56E-07
-2.80E-07
-2.37E-07
-2.35E-07
30
-2.61E-07
-2.27E-07
-2.33E-07
-2.77E-07
-2.78E-07
-2.36E-07
-2.70E-07
-3.00E-07
-2.62E-07
-2.86E-07
-2.36E-07
-2.34E-07
50
-2.66E-07
-2.32E-07
-2.36E-07
-2.84E-07
-2.85E-07
-2.47E-07
-2.81E-07
-3.18E-07
-2.73E-07
-2.99E-07
-2.36E-07
-2.34E-07
60
-2.66E-07
-2.32E-07
-2.36E-07
-2.84E-07
-2.85E-07
-2.46E-07
-2.80E-07
-3.17E-07
-2.72E-07
-2.97E-07
-2.36E-07
-2.33E-07
70
-2.61E-07
-2.27E-07
-2.32E-07
-2.79E-07
-2.78E-07
-2.29E-07
-2.63E-07
-2.90E-07
-2.55E-07
-2.76E-07
-2.36E-07
-2.33E-07
-2.47E-07
2.34E-08
-1.83E-07
-3.11E-07
-2.51E-07
2.38E-08
-1.86E-07
-3.16E-07
-2.54E-07
2.40E-08
-1.88E-07
-3.20E-07
-2.55E-07
2.43E-08
-1.89E-07
-3.22E-07
-2.61E-07
2.52E-08
-1.91E-07
-3.30E-07
-2.61E-07
2.51E-08
-1.92E-07
-3.30E-07
-2.56E-07
2.47E-08
-1.88E-07
-3.23E-07
-2.49E-07 -2.60E-07 -2.66E-07 -2.71E-07 -2.84E-07 -2.82E-07 -2.63E-07
2.11E-08
2.22E-08
2.34E-08
2.45E-08
2.70E-08
2.66E-08
2.30E-08
-1.91E-07 -1.99E-07 -2.01E-07 -2.04E-07 -2.09E-07 -2.09E-07 -2.00E-07
-3.06E-07 -3.21E-07 -3.30E-07 -3.38E-07 -3.58E-07 -3.55E-07 -3.26E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.11. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.11. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.80E-04
3.32E-04
1.00E-05
1.81E-04
-3.88E-05
-2.15E-05
7.53E-05
3.04E-04
2.09E-04
2.60E-04
1.55E-05
6.78E-05
10
1.63E-04
3.05E-04
-1.40E-05
1.53E-04
-7.25E-05
-3.18E-05
5.99E-05
2.89E-04
1.93E-04
2.60E-04
1.52E-05
6.82E-05
20
1.70E-04
3.16E-04
-1.17E-05
1.58E-04
-6.39E-05
-2.75E-05
6.25E-05
2.93E-04
1.98E-04
2.67E-04
1.70E-05
6.68E-05
30
1.76E-04
3.21E-04
-3.87E-06
1.61E-04
-6.04E-05
-2.32E-05
6.31E-05
2.97E-04
1.98E-04
2.72E-04
1.93E-05
6.77E-05
50
1.77E-04
3.25E-04
-3.51E-06
1.59E-04
-6.64E-05
-2.33E-05
6.48E-05
2.97E-04
1.99E-04
2.82E-04
2.12E-05
6.59E-05
60
1.76E-04
3.25E-04
-2.78E-06
1.60E-04
-6.57E-05
-2.30E-05
6.51E-05
2.96E-04
1.99E-04
2.81E-04
2.11E-05
6.53E-05
70
1.86E-04
3.22E-04
-5.01E-05
1.76E-04
-5.64E-05
-1.68E-05
7.86E-05
2.75E-04
1.90E-04
2.44E-04
2.00E-05
6.66E-05
1.33E-04
1.49E-04
5.41E-04
-2.75E-04
1.07E-04
1.51E-04
5.21E-04
-3.07E-04
1.14E-04
1.53E-04
5.33E-04
-3.05E-04
1.19E-04
1.53E-04
5.37E-04
-3.00E-04
1.18E-04
1.55E-04
5.44E-04
-3.08E-04
1.18E-04
1.55E-04
5.44E-04
-3.07E-04
1.16E-04
1.64E-04
5.67E-04
-3.36E-04
1.65E-04
1.54E-04
1.59E-04
1.61E-04
1.64E-04
1.64E-04
1.54E-04
1.35E-04
1.36E-04
1.37E-04
1.38E-04
1.39E-04
1.39E-04
1.21E-04
5.36E-04
5.27E-04
5.35E-04
5.39E-04
5.46E-04
5.44E-04
4.87E-04
-2.05E-04 -2.20E-04 -2.18E-04 -2.16E-04 -2.18E-04 -2.17E-04 -1.79E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
29
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.12. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.12. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.07E-04
1.53E-04
2.13E-04
-1.05E-04
-1.06E-04
2.73E-04
2.03E-04
3.96E-05
2.99E-05
2.91E-04
3.67E-04
2.21E-04
10
2.87E-04
1.34E-04
1.76E-04
-1.37E-04
-1.40E-04
2.65E-04
1.91E-04
4.24E-05
1.86E-05
2.90E-04
3.67E-04
2.21E-04
20
2.94E-04
1.43E-04
1.80E-04
-1.34E-04
-1.23E-04
2.68E-04
1.93E-04
6.63E-05
2.28E-05
2.96E-04
3.70E-04
2.31E-04
30
2.96E-04
1.47E-04
1.83E-04
-1.33E-04
-1.24E-04
2.72E-04
1.96E-04
9.36E-05
2.03E-05
2.99E-04
3.73E-04
2.33E-04
50
3.00E-04
1.48E-04
1.79E-04
-1.31E-04
-1.24E-04
2.76E-04
1.95E-04
1.35E-04
2.40E-05
3.05E-04
3.72E-04
2.24E-04
60
3.00E-04
1.47E-04
1.79E-04
-1.31E-04
-1.24E-04
2.76E-04
1.96E-04
1.31E-04
2.46E-05
3.04E-04
3.72E-04
2.24E-04
70
3.01E-04
1.55E-04
1.37E-04
-1.30E-04
-1.08E-04
2.61E-04
2.08E-04
4.09E-05
2.41E-05
2.80E-04
3.73E-04
2.24E-04
9.22E-05
1.89E-04
6.10E-04
-4.26E-04
6.38E-05
1.93E-04
5.93E-04
-4.65E-04
7.19E-05
1.91E-04
5.97E-04
-4.53E-04
7.40E-05
1.93E-04
6.03E-04
-4.55E-04
7.43E-05
1.93E-04
6.03E-04
-4.54E-04
7.41E-05
1.93E-04
6.03E-04
-4.55E-04
7.10E-05
1.85E-04
5.78E-04
-4.36E-04
1.67E-04
1.61E-04
1.69E-04
1.76E-04
1.87E-04
1.86E-04
1.63E-04
1.26E-04
1.25E-04
1.21E-04
1.18E-04
1.13E-04
1.13E-04
1.22E-04
5.12E-04
5.05E-04
5.01E-04
5.00E-04
4.97E-04
4.97E-04
4.97E-04
-1.77E-04 -1.82E-04 -1.62E-04 -1.48E-04 -1.23E-04 -1.24E-04 -1.72E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
31
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 15 V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.13. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.13. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.96E-09
7.79E-10
-3.38E-09
-5.15E-09
1.63E-09
3.80E-11
5.02E-09
-8.12E-09
-1.98E-09
1.19E-08
-2.62E-09
8.52E-09
10
4.46E-09
1.78E-09
-2.89E-09
-4.19E-09
3.83E-10
-1.17E-09
5.27E-09
-7.09E-09
-2.23E-09
1.80E-08
-2.61E-09
8.54E-09
20
3.21E-09
1.58E-09
-4.36E-09
-5.26E-09
-1.15E-09
-1.66E-09
6.23E-09
-6.29E-09
-1.43E-09
1.70E-08
-2.55E-09
8.40E-09
30
3.14E-09
1.12E-09
-3.80E-09
-5.68E-09
-1.41E-09
-8.38E-10
6.67E-09
-7.56E-09
-1.49E-09
1.69E-08
-2.59E-09
8.30E-09
50
2.55E-09
-4.09E-10
-5.48E-09
-8.32E-09
-3.85E-09
-1.77E-09
6.21E-09
-8.81E-09
-6.29E-10
1.65E-08
-2.62E-09
8.33E-09
60
2.60E-09
1.76E-10
-4.91E-09
-7.88E-09
-3.24E-09
-1.59E-09
5.67E-09
-8.30E-09
-1.14E-09
1.64E-08
-2.58E-09
8.27E-09
70
1.46E-08
1.34E-08
7.46E-09
6.81E-09
1.56E-08
-6.06E-10
5.69E-09
-9.59E-09
-1.15E-09
1.36E-08
-2.50E-09
8.28E-09
-6.33E-10
3.46E-09
8.86E-09
-1.01E-08
-9.22E-11
3.50E-09
9.52E-09
-9.70E-09
-1.20E-09
3.66E-09
8.84E-09
-1.12E-08
-1.32E-09
3.57E-09
8.47E-09
-1.11E-08
-3.10E-09
4.26E-09
8.58E-09
-1.48E-08
-2.65E-09
4.13E-09
8.68E-09
-1.40E-08
1.16E-08
4.12E-09
2.29E-08
2.56E-10
1.37E-09
2.55E-09
2.78E-09
2.74E-09
2.30E-09
2.20E-09
1.58E-09
7.53E-09
9.68E-09
9.15E-09
9.39E-09
9.56E-09
9.33E-09
8.62E-09
2.20E-08
2.91E-08
2.79E-08
2.85E-08
2.85E-08
2.78E-08
2.52E-08
-1.93E-08 -2.40E-08 -2.23E-08 -2.30E-08 -2.39E-08 -2.34E-08 -2.21E-08
-7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.00E-08
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 15 V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.14. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.14. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
9.17E-09
3.73E-09
8.93E-09
2.39E-09
-5.31E-09
6.33E-09
1.11E-08
-1.59E-09
8.35E-09
-1.70E-11
2.40E-09
8.30E-11
10
9.70E-09
4.25E-09
8.35E-09
3.55E-09
-5.55E-09
6.59E-09
1.16E-08
6.60E-10
8.74E-09
2.49E-09
2.21E-09
4.70E-11
20
9.29E-09
4.04E-09
8.39E-09
2.69E-09
-7.03E-09
7.21E-09
1.16E-08
2.76E-09
7.67E-09
2.51E-09
2.32E-09
1.70E-10
30
8.17E-09
3.19E-09
8.55E-09
2.72E-09
-6.65E-09
7.88E-09
1.10E-08
4.75E-09
7.54E-09
1.18E-09
2.27E-09
1.32E-10
50
6.88E-09
1.83E-09
5.81E-09
1.74E-09
-8.34E-09
7.81E-09
1.14E-08
7.05E-09
7.82E-09
3.83E-10
2.33E-09
3.90E-11
60
7.84E-09
1.94E-09
7.06E-09
1.85E-09
-8.68E-09
8.02E-09
1.23E-08
6.66E-09
7.39E-09
3.88E-10
2.28E-09
2.30E-11
70
1.87E-08
1.68E-08
1.97E-08
1.33E-08
1.03E-08
6.37E-09
1.11E-08
3.43E-10
8.57E-09
1.55E-09
2.32E-09
9.90E-11
3.78E-09
5.92E-09
2.00E-08
-1.24E-08
4.06E-09
5.97E-09
2.04E-08
-1.23E-08
3.48E-09
6.50E-09
2.13E-08
-1.44E-08
3.20E-09
6.13E-09
2.00E-08
-1.36E-08
1.58E-09
6.01E-09
1.81E-08
-1.49E-08
2.00E-09
6.59E-09
2.01E-08
-1.61E-08
1.57E-08
3.88E-09
2.64E-08
5.09E-09
4.84E-09
6.02E-09
6.35E-09
6.46E-09
6.89E-09
6.96E-09
5.58E-09
5.45E-09
4.48E-09
3.80E-09
3.68E-09
4.00E-09
4.28E-09
4.57E-09
1.98E-08
1.83E-08
1.68E-08
1.66E-08
1.79E-08
1.87E-08
1.81E-08
-1.01E-08 -6.27E-09 -4.08E-09 -3.63E-09 -4.09E-09 -4.79E-09 -6.96E-09
-7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.00E-08
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
35
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 15 V #1
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.15. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.15. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.25E-07
2.96E-07
2.87E-07
3.16E-07
3.24E-07
2.80E-07
3.23E-07
3.13E-07
3.02E-07
3.22E-07
2.96E-07
2.94E-07
10
3.46E-07
3.20E-07
3.08E-07
3.37E-07
3.47E-07
3.14E-07
3.53E-07
3.55E-07
3.34E-07
3.68E-07
2.96E-07
2.93E-07
20
3.58E-07
3.38E-07
3.22E-07
3.49E-07
3.67E-07
3.38E-07
3.75E-07
3.89E-07
3.54E-07
3.98E-07
2.94E-07
2.92E-07
30
3.72E-07
3.50E-07
3.35E-07
3.63E-07
3.83E-07
3.54E-07
3.91E-07
4.13E-07
3.72E-07
4.21E-07
2.94E-07
2.92E-07
50
3.98E-07
3.77E-07
3.55E-07
3.89E-07
4.10E-07
3.86E-07
4.25E-07
4.58E-07
4.04E-07
4.63E-07
2.94E-07
2.92E-07
60
3.96E-07
3.74E-07
3.53E-07
3.89E-07
4.10E-07
3.83E-07
4.21E-07
4.54E-07
3.99E-07
4.59E-07
2.94E-07
2.91E-07
70
3.80E-07
3.58E-07
3.39E-07
3.73E-07
3.90E-07
3.39E-07
3.77E-07
3.81E-07
3.57E-07
3.91E-07
2.94E-07
2.91E-07
3.10E-07
1.72E-08
3.57E-07
2.63E-07
3.32E-07
1.71E-08
3.79E-07
2.85E-07
3.47E-07
1.75E-08
3.95E-07
2.99E-07
3.61E-07
1.88E-08
4.12E-07
3.09E-07
3.86E-07
2.10E-08
4.43E-07
3.28E-07
3.84E-07
2.17E-08
4.44E-07
3.25E-07
3.68E-07
2.00E-08
4.23E-07
3.13E-07
3.08E-07
3.45E-07
3.71E-07
3.90E-07
4.27E-07
4.23E-07
3.69E-07
1.77E-08
2.12E-08
2.48E-08
2.78E-08
3.35E-08
3.34E-08
2.08E-08
3.56E-07
4.03E-07
4.39E-07
4.67E-07
5.19E-07
5.15E-07
4.26E-07
2.59E-07
2.87E-07
3.03E-07
3.14E-07
3.35E-07
3.32E-07
3.12E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 15 V #2
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.16. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.16. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.24E-07
2.91E-07
2.85E-07
3.25E-07
3.19E-07
2.85E-07
3.16E-07
3.32E-07
3.10E-07
3.09E-07
2.99E-07
2.85E-07
10
3.42E-07
3.15E-07
3.05E-07
3.44E-07
3.44E-07
3.21E-07
3.47E-07
3.84E-07
3.40E-07
3.51E-07
2.98E-07
2.85E-07
20
3.57E-07
3.33E-07
3.20E-07
3.59E-07
3.62E-07
3.41E-07
3.68E-07
4.27E-07
3.62E-07
3.82E-07
2.97E-07
2.84E-07
30
3.69E-07
3.44E-07
3.31E-07
3.73E-07
3.78E-07
3.59E-07
3.86E-07
4.62E-07
3.79E-07
4.04E-07
2.96E-07
2.83E-07
50
3.93E-07
3.71E-07
3.53E-07
3.98E-07
4.08E-07
3.92E-07
4.19E-07
5.27E-07
4.12E-07
4.42E-07
2.96E-07
2.83E-07
60
3.92E-07
3.70E-07
3.52E-07
3.97E-07
4.06E-07
3.89E-07
4.16E-07
5.22E-07
4.09E-07
4.40E-07
2.96E-07
2.83E-07
70
3.77E-07
3.55E-07
3.37E-07
3.80E-07
3.88E-07
3.43E-07
3.71E-07
4.20E-07
3.65E-07
3.76E-07
2.96E-07
2.83E-07
3.09E-07
1.94E-08
3.62E-07
2.56E-07
3.30E-07
1.85E-08
3.80E-07
2.79E-07
3.46E-07
1.85E-08
3.97E-07
2.95E-07
3.59E-07
2.03E-08
4.15E-07
3.03E-07
3.85E-07
2.22E-08
4.46E-07
3.24E-07
3.84E-07
2.19E-08
4.44E-07
3.23E-07
3.67E-07
2.10E-08
4.25E-07
3.10E-07
3.11E-07
3.49E-07
3.76E-07
3.98E-07
4.38E-07
4.35E-07
3.75E-07
1.67E-08
2.32E-08
3.22E-08
3.91E-08
5.27E-08
5.17E-08
2.81E-08
3.56E-07
4.12E-07
4.64E-07
5.05E-07
5.83E-07
5.77E-07
4.52E-07
2.65E-07
2.85E-07
2.88E-07
2.91E-07
2.94E-07
2.93E-07
2.98E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
39
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 15 V #1
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.17. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.17. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.22E-07
2.94E-07
2.90E-07
3.21E-07
3.22E-07
2.79E-07
3.17E-07
3.20E-07
3.03E-07
3.10E-07
2.98E-07
2.85E-07
10
3.40E-07
3.18E-07
3.11E-07
3.41E-07
3.45E-07
3.14E-07
3.47E-07
3.61E-07
3.36E-07
3.49E-07
2.98E-07
2.85E-07
20
3.53E-07
3.36E-07
3.27E-07
3.54E-07
3.67E-07
3.39E-07
3.67E-07
3.92E-07
3.55E-07
3.79E-07
2.97E-07
2.84E-07
30
3.68E-07
3.48E-07
3.38E-07
3.68E-07
3.83E-07
3.54E-07
3.85E-07
4.18E-07
3.71E-07
4.04E-07
2.96E-07
2.83E-07
50
3.93E-07
3.78E-07
3.60E-07
3.96E-07
4.13E-07
3.86E-07
4.16E-07
4.67E-07
4.03E-07
4.47E-07
2.96E-07
2.83E-07
60
3.91E-07
3.74E-07
3.57E-07
3.94E-07
4.12E-07
3.84E-07
4.15E-07
4.63E-07
4.02E-07
4.43E-07
2.96E-07
2.83E-07
70
3.65E-07
3.45E-07
3.31E-07
3.66E-07
3.72E-07
3.40E-07
3.70E-07
3.90E-07
3.57E-07
3.76E-07
2.96E-07
2.83E-07
3.10E-07
1.61E-08
3.54E-07
2.66E-07
3.31E-07
1.55E-08
3.73E-07
2.89E-07
3.47E-07
1.57E-08
3.90E-07
3.04E-07
3.61E-07
1.79E-08
4.10E-07
3.12E-07
3.88E-07
2.01E-08
4.43E-07
3.33E-07
3.86E-07
2.12E-08
4.44E-07
3.28E-07
3.56E-07
1.71E-08
4.03E-07
3.09E-07
3.06E-07
3.42E-07
3.67E-07
3.86E-07
4.24E-07
4.21E-07
3.67E-07
1.63E-08
1.76E-08
2.05E-08
2.58E-08
3.28E-08
3.16E-08
1.91E-08
3.51E-07
3.90E-07
4.23E-07
4.57E-07
5.14E-07
5.08E-07
4.19E-07
2.61E-07
2.93E-07
3.10E-07
3.16E-07
3.34E-07
3.35E-07
3.14E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
41
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 15 V #2
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.18. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.18. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.15E-07
2.87E-07
2.75E-07
3.22E-07
3.24E-07
2.79E-07
3.05E-07
3.33E-07
3.02E-07
3.09E-07
2.96E-07
2.84E-07
10
3.34E-07
3.10E-07
2.96E-07
3.41E-07
3.48E-07
3.14E-07
3.37E-07
3.81E-07
3.34E-07
3.47E-07
2.95E-07
2.84E-07
20
3.46E-07
3.29E-07
3.12E-07
3.56E-07
3.69E-07
3.37E-07
3.56E-07
4.22E-07
3.54E-07
3.76E-07
2.94E-07
2.83E-07
30
3.60E-07
3.40E-07
3.24E-07
3.71E-07
3.84E-07
3.51E-07
3.73E-07
4.57E-07
3.72E-07
4.02E-07
2.94E-07
2.83E-07
50
3.87E-07
3.70E-07
3.47E-07
3.98E-07
4.16E-07
3.83E-07
4.06E-07
5.20E-07
4.04E-07
4.43E-07
2.93E-07
2.83E-07
60
3.85E-07
3.68E-07
3.45E-07
3.96E-07
4.14E-07
3.82E-07
4.03E-07
5.14E-07
4.02E-07
4.38E-07
2.94E-07
2.83E-07
70
3.57E-07
3.41E-07
3.17E-07
3.68E-07
3.76E-07
3.39E-07
3.58E-07
4.18E-07
3.56E-07
3.75E-07
2.93E-07
2.83E-07
3.05E-07
2.21E-08
3.65E-07
2.44E-07
3.26E-07
2.16E-08
3.85E-07
2.67E-07
3.42E-07
2.22E-08
4.03E-07
2.82E-07
3.56E-07
2.42E-08
4.22E-07
2.89E-07
3.84E-07
2.66E-08
4.57E-07
3.11E-07
3.81E-07
2.65E-08
4.54E-07
3.09E-07
3.52E-07
2.34E-08
4.16E-07
2.88E-07
3.05E-07
3.43E-07
3.69E-07
3.91E-07
4.31E-07
4.28E-07
3.69E-07
1.91E-08
2.48E-08
3.25E-08
4.11E-08
5.41E-08
5.21E-08
3.04E-08
3.58E-07
4.11E-07
4.58E-07
5.04E-07
5.80E-07
5.70E-07
4.52E-07
2.53E-07
2.75E-07
2.80E-07
2.78E-07
2.83E-07
2.85E-07
2.86E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
43
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.19. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.19. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
4.00E-05
2.50E-04
-5.91E-05
2.89E-06
-1.86E-04
-1.62E-04
2.63E-05
3.94E-05
4.97E-05
1.54E-04
-6.90E-05
-2.49E-04
10
2.34E-05
2.16E-04
-8.01E-05
-2.71E-05
-2.11E-04
-1.70E-04
8.08E-06
2.22E-05
3.57E-05
1.43E-04
-6.99E-05
-2.47E-04
20
3.39E-05
2.29E-04
-7.45E-05
-1.87E-05
-2.00E-04
-1.68E-04
9.41E-06
2.39E-05
4.14E-05
1.52E-04
-6.94E-05
-2.49E-04
30
3.88E-05
2.32E-04
-6.11E-05
-1.39E-05
-1.95E-04
-1.64E-04
9.89E-06
2.79E-05
4.10E-05
1.54E-04
-6.58E-05
-2.48E-04
50
4.08E-05
2.34E-04
-5.69E-05
-1.51E-05
-2.04E-04
-1.65E-04
7.72E-06
2.56E-05
3.97E-05
1.61E-04
-6.53E-05
-2.52E-04
60
4.00E-05
2.35E-04
-5.78E-05
-1.33E-05
-2.03E-04
-1.64E-04
9.53E-06
2.52E-05
4.03E-05
1.60E-04
-6.40E-05
-2.54E-04
70
6.37E-05
2.15E-04
-8.69E-05
-2.23E-05
-1.97E-04
-1.59E-04
1.63E-05
1.44E-06
2.76E-05
1.28E-04
-6.61E-05
-2.51E-04
9.55E-06
1.59E-04
4.46E-04
-4.27E-04
-1.57E-05
1.56E-04
4.13E-04
-4.44E-04
-6.19E-06
1.57E-04
4.26E-04
-4.38E-04
6.40E-08
1.56E-04
4.28E-04
-4.28E-04
-2.00E-07
1.60E-04
4.37E-04
-4.38E-04
1.38E-07
1.59E-04
4.37E-04
-4.37E-04
-5.47E-06
1.56E-04
4.22E-04
-4.33E-04
2.16E-05
7.84E-06
1.17E-05
1.38E-05
1.37E-05
1.43E-05
2.91E-06
1.14E-04
1.13E-04
1.15E-04
1.14E-04
1.17E-04
1.16E-04
1.03E-04
3.35E-04
3.17E-04
3.27E-04
3.27E-04
3.33E-04
3.33E-04
2.86E-04
-2.92E-04 -3.02E-04 -3.03E-04 -2.99E-04 -3.06E-04 -3.04E-04 -2.81E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
45
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.20. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.20. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.87E-04
-1.80E-04
-4.53E-05
-1.71E-04
-3.40E-04
5.46E-05
3.81E-05
-2.24E-04
-2.24E-04
9.51E-05
8.56E-06
1.70E-04
10
1.64E-04
-1.99E-04
-8.68E-05
-2.00E-04
-3.74E-04
4.33E-05
2.19E-05
-2.19E-04
-2.34E-04
8.33E-05
6.51E-06
1.71E-04
20
1.71E-04
-1.94E-04
-8.44E-05
-1.94E-04
-3.51E-04
4.61E-05
2.60E-05
-1.91E-04
-2.30E-04
8.84E-05
1.01E-05
1.82E-04
30
1.75E-04
-1.90E-04
-8.21E-05
-1.92E-04
-3.54E-04
4.50E-05
2.60E-05
-1.63E-04
-2.34E-04
9.04E-05
1.05E-05
1.84E-04
50
1.74E-04
-1.89E-04
-8.72E-05
-1.86E-04
-3.52E-04
4.64E-05
2.39E-05
-1.17E-04
-2.32E-04
9.13E-05
9.89E-06
1.75E-04
60
1.73E-04
-1.90E-04
-8.74E-05
-1.88E-04
-3.53E-04
4.73E-05
2.29E-05
-1.22E-04
-2.30E-04
9.30E-05
9.05E-06
1.77E-04
70
1.60E-04
-2.06E-04
-1.20E-04
-1.69E-04
-3.63E-04
2.08E-05
1.55E-05
-2.22E-04
-2.30E-04
5.11E-05
9.41E-06
1.75E-04
-1.10E-04
1.96E-04
4.27E-04
-6.47E-04
-1.39E-04
1.98E-04
4.05E-04
-6.83E-04
-1.30E-04
1.93E-04
4.00E-04
-6.60E-04
-1.28E-04
1.95E-04
4.07E-04
-6.64E-04
-1.28E-04
1.94E-04
4.03E-04
-6.60E-04
-1.29E-04
1.94E-04
4.02E-04
-6.60E-04
-1.40E-04
1.91E-04
3.83E-04
-6.62E-04
-5.20E-05 -6.09E-05 -5.21E-05 -4.71E-05 -3.76E-05 -3.77E-05 -7.30E-05
1.58E-04
1.53E-04
1.47E-04
1.42E-04
1.34E-04
1.34E-04
1.40E-04
3.82E-04
3.58E-04
3.51E-04
3.43E-04
3.29E-04
3.30E-04
3.12E-04
-4.86E-04 -4.80E-04 -4.55E-04 -4.38E-04 -4.04E-04 -4.05E-04 -4.58E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
47
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.21. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.21. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= -15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
5.88E-09
-2.78E-09
5.05E-09
-2.02E-09
3.97E-10
1.25E-08
-2.99E-10
1.42E-09
2.76E-09
2.52E-09
8.06E-10
-7.89E-09
10
5.94E-09
-3.50E-09
4.59E-09
-2.50E-09
3.54E-10
1.21E-08
-9.79E-10
1.44E-09
3.03E-09
2.01E-09
7.26E-10
-7.81E-09
20
5.96E-09
-3.13E-09
4.83E-09
-2.09E-09
-2.47E-10
1.18E-08
-1.44E-09
2.31E-09
3.42E-09
1.93E-09
7.92E-10
-7.65E-09
30
5.78E-09
-3.24E-09
4.68E-09
-2.09E-09
-4.44E-10
1.10E-08
-2.16E-09
2.32E-09
3.78E-09
1.85E-09
7.30E-10
-7.49E-09
50
5.44E-09
-2.99E-09
5.09E-09
-2.47E-09
-6.71E-10
1.07E-08
-2.39E-09
2.78E-09
4.17E-09
2.70E-09
7.18E-10
-7.48E-09
60
5.66E-09
-2.94E-09
5.15E-09
-2.74E-09
-1.85E-10
1.08E-08
-1.95E-09
2.79E-09
4.17E-09
2.37E-09
7.32E-10
-7.39E-09
70
5.91E-09
-3.32E-09
4.62E-09
-2.08E-09
4.20E-10
1.11E-08
-8.38E-10
1.67E-09
3.53E-09
2.52E-09
7.15E-10
-7.37E-09
1.30E-09
3.98E-09
1.22E-08
-9.62E-09
9.77E-10
4.19E-09
1.25E-08
-1.05E-08
1.06E-09
4.11E-09
1.23E-08
-1.02E-08
9.39E-10
4.06E-09
1.21E-08
-1.02E-08
8.80E-10
4.10E-09
1.21E-08
-1.03E-08
9.89E-10
4.18E-09
1.24E-08
-1.05E-08
1.11E-09
4.05E-09
1.22E-08
-1.00E-08
3.78E-09
3.52E-09
3.59E-09
3.35E-09
3.59E-09
3.64E-09
3.59E-09
5.01E-09
5.01E-09
4.91E-09
4.79E-09
4.69E-09
4.61E-09
4.49E-09
1.75E-08
1.73E-08
1.71E-08
1.65E-08
1.64E-08
1.63E-08
1.59E-08
-9.97E-09 -1.02E-08 -9.86E-09 -9.79E-09 -9.27E-09 -9.02E-09 -8.72E-09
-7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.00E-08
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
49
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.22. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.22. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= -15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.85E-10
5.16E-09
-1.11E-09
2.38E-09
-1.66E-09
2.94E-09
-3.45E-09
4.89E-09
-9.06E-09
2.53E-09
-1.39E-10
9.80E-11
10
2.67E-10
5.43E-09
-1.41E-09
2.21E-09
-1.99E-09
2.71E-09
-4.12E-09
5.03E-09
-8.96E-09
3.71E-09
-1.16E-10
1.23E-10
20
-1.80E-10
5.54E-09
-1.71E-09
2.46E-09
-1.54E-09
3.51E-09
-3.75E-09
5.19E-09
-8.53E-09
4.52E-09
-6.20E-11
2.66E-10
30
4.75E-10
5.11E-09
-2.00E-09
2.40E-09
-2.06E-09
3.22E-09
-3.30E-09
4.40E-09
-8.04E-09
4.94E-09
-1.86E-10
2.18E-10
50
-9.93E-10
4.96E-09
-2.82E-09
2.67E-09
-2.19E-09
4.13E-09
-3.30E-09
5.46E-09
-7.97E-09
5.46E-09
-1.14E-10
1.52E-10
60
-8.91E-10
5.14E-09
-2.64E-09
2.49E-09
-2.16E-09
4.09E-09
-3.28E-09
5.00E-09
-8.17E-09
5.84E-09
-1.49E-10
5.10E-11
70
4.09E-10
5.29E-09
-1.97E-09
2.90E-09
-1.67E-09
3.28E-09
-2.96E-09
4.17E-09
-8.54E-09
4.35E-09
-1.59E-10
1.46E-10
9.91E-10
2.80E-09
8.68E-09
-6.69E-09
9.00E-10
3.01E-09
9.16E-09
-7.36E-09
9.17E-10
3.08E-09
9.35E-09
-7.52E-09
7.85E-10
3.05E-09
9.15E-09
-7.58E-09
3.26E-10
3.35E-09
9.51E-09
-8.86E-09
3.89E-10
3.33E-09
9.51E-09
-8.73E-09
9.92E-10
3.09E-09
9.47E-09
-7.49E-09
-4.29E-10 -3.26E-10
1.91E-10
2.43E-10
7.59E-10
6.95E-10
5.98E-11
5.74E-09
5.98E-09
6.05E-09
5.68E-09
6.09E-09
6.14E-09
5.67E-09
1.53E-08
1.61E-08
1.68E-08
1.58E-08
1.75E-08
1.75E-08
1.56E-08
-1.62E-08 -1.67E-08 -1.64E-08 -1.53E-08 -1.59E-08 -1.61E-08 -1.55E-08
-7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.00E-08
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
1.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
51
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= -15 V #1
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.23. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.23. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.17E-07
-2.99E-07
-2.90E-07
-3.40E-07
-3.33E-07
-2.76E-07
-3.16E-07
-3.32E-07
-3.08E-07
-3.23E-07
-2.93E-07
-3.02E-07
10
-3.21E-07
-3.04E-07
-2.95E-07
-3.49E-07
-3.38E-07
-2.89E-07
-3.29E-07
-3.47E-07
-3.20E-07
-3.38E-07
-2.92E-07
-3.02E-07
20
-3.25E-07
-3.08E-07
-2.97E-07
-3.53E-07
-3.44E-07
-2.95E-07
-3.35E-07
-3.56E-07
-3.25E-07
-3.49E-07
-2.90E-07
-3.00E-07
30
-3.27E-07
-3.08E-07
-2.99E-07
-3.53E-07
-3.46E-07
-3.00E-07
-3.44E-07
-3.63E-07
-3.32E-07
-3.56E-07
-2.89E-07
-2.98E-07
50
-3.34E-07
-3.15E-07
-3.03E-07
-3.61E-07
-3.54E-07
-3.13E-07
-3.58E-07
-3.78E-07
-3.46E-07
-3.71E-07
-2.89E-07
-2.98E-07
60
-3.34E-07
-3.15E-07
-3.03E-07
-3.61E-07
-3.55E-07
-3.12E-07
-3.56E-07
-3.77E-07
-3.47E-07
-3.71E-07
-2.88E-07
-2.98E-07
70
-3.27E-07
-3.09E-07
-2.98E-07
-3.54E-07
-3.46E-07
-2.92E-07
-3.32E-07
-3.53E-07
-3.23E-07
-3.43E-07
-2.88E-07
-2.97E-07
-3.16E-07
2.16E-08
-2.57E-07
-3.75E-07
-3.21E-07
2.24E-08
-2.60E-07
-3.83E-07
-3.25E-07
2.35E-08
-2.61E-07
-3.90E-07
-3.27E-07
2.35E-08
-2.62E-07
-3.91E-07
-3.34E-07
2.47E-08
-2.66E-07
-4.01E-07
-3.34E-07
2.48E-08
-2.66E-07
-4.02E-07
-3.27E-07
2.37E-08
-2.62E-07
-3.92E-07
-3.11E-07 -3.25E-07 -3.32E-07 -3.39E-07 -3.53E-07 -3.53E-07 -3.29E-07
2.16E-08
2.25E-08
2.39E-08
2.47E-08
2.57E-08
2.58E-08
2.33E-08
-2.52E-07 -2.63E-07 -2.67E-07 -2.71E-07 -2.83E-07 -2.82E-07 -2.65E-07
-3.70E-07 -3.86E-07 -3.98E-07 -4.07E-07 -4.24E-07 -4.23E-07 -3.92E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
53
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= -15 V #2
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.24. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.24. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.16E-07
-2.89E-07
-2.87E-07
-3.39E-07
-3.32E-07
-2.73E-07
-3.18E-07
-3.37E-07
-3.17E-07
-3.20E-07
-3.03E-07
-2.97E-07
10
-3.20E-07
-2.95E-07
-2.92E-07
-3.45E-07
-3.38E-07
-2.85E-07
-3.30E-07
-3.53E-07
-3.29E-07
-3.34E-07
-3.02E-07
-2.97E-07
20
-3.25E-07
-2.98E-07
-2.94E-07
-3.50E-07
-3.41E-07
-2.91E-07
-3.36E-07
-3.64E-07
-3.34E-07
-3.45E-07
-3.00E-07
-2.95E-07
30
-3.26E-07
-3.00E-07
-2.96E-07
-3.51E-07
-3.46E-07
-2.96E-07
-3.44E-07
-3.74E-07
-3.41E-07
-3.51E-07
-2.98E-07
-2.93E-07
50
-3.34E-07
-3.07E-07
-3.01E-07
-3.59E-07
-3.53E-07
-3.08E-07
-3.57E-07
-3.95E-07
-3.55E-07
-3.65E-07
-2.98E-07
-2.93E-07
60
-3.34E-07
-3.07E-07
-3.01E-07
-3.58E-07
-3.54E-07
-3.07E-07
-3.55E-07
-3.94E-07
-3.54E-07
-3.63E-07
-2.98E-07
-2.93E-07
70
-3.27E-07
-3.00E-07
-2.95E-07
-3.52E-07
-3.45E-07
-2.88E-07
-3.33E-07
-3.63E-07
-3.32E-07
-3.36E-07
-2.97E-07
-2.93E-07
-3.13E-07
2.39E-08
-2.47E-07
-3.78E-07
-3.18E-07
2.43E-08
-2.51E-07
-3.85E-07
-3.22E-07
2.49E-08
-2.53E-07
-3.90E-07
-3.24E-07
2.55E-08
-2.54E-07
-3.94E-07
-3.31E-07
2.62E-08
-2.59E-07
-4.03E-07
-3.31E-07
2.64E-08
-2.59E-07
-4.03E-07
-3.24E-07
2.56E-08
-2.54E-07
-3.94E-07
-3.13E-07 -3.27E-07 -3.34E-07 -3.41E-07 -3.56E-07 -3.54E-07 -3.30E-07
2.41E-08
2.51E-08
2.66E-08
2.85E-08
3.16E-08
3.12E-08
2.68E-08
-2.47E-07 -2.58E-07 -2.61E-07 -2.63E-07 -2.70E-07 -2.69E-07 -2.57E-07
-3.79E-07 -3.95E-07 -4.07E-07 -4.19E-07 -4.43E-07 -4.40E-07 -4.04E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
55
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= -15 V #1
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.25. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.25. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.23E-07
-2.95E-07
-2.95E-07
-3.38E-07
-3.33E-07
-2.88E-07
-3.16E-07
-3.34E-07
-3.11E-07
-3.25E-07
-2.93E-07
-2.94E-07
10
-3.27E-07
-3.00E-07
-3.00E-07
-3.46E-07
-3.39E-07
-3.01E-07
-3.28E-07
-3.49E-07
-3.23E-07
-3.40E-07
-2.92E-07
-2.94E-07
20
-3.31E-07
-3.04E-07
-3.02E-07
-3.49E-07
-3.47E-07
-3.07E-07
-3.34E-07
-3.59E-07
-3.28E-07
-3.51E-07
-2.91E-07
-2.92E-07
30
-3.32E-07
-3.05E-07
-3.03E-07
-3.52E-07
-3.46E-07
-3.11E-07
-3.39E-07
-3.64E-07
-3.36E-07
-3.58E-07
-2.89E-07
-2.91E-07
50
-3.40E-07
-3.12E-07
-3.08E-07
-3.59E-07
-3.53E-07
-3.23E-07
-3.55E-07
-3.81E-07
-3.51E-07
-3.74E-07
-2.89E-07
-2.91E-07
60
-3.40E-07
-3.12E-07
-3.08E-07
-3.60E-07
-3.56E-07
-3.22E-07
-3.54E-07
-3.79E-07
-3.51E-07
-3.72E-07
-2.89E-07
-2.90E-07
70
-3.33E-07
-3.06E-07
-3.02E-07
-3.51E-07
-3.47E-07
-3.03E-07
-3.31E-07
-3.55E-07
-3.26E-07
-3.46E-07
-2.89E-07
-2.90E-07
-3.17E-07
2.05E-08
-2.61E-07
-3.73E-07
-3.22E-07
2.13E-08
-2.64E-07
-3.81E-07
-3.27E-07
2.27E-08
-2.64E-07
-3.89E-07
-3.28E-07
2.28E-08
-2.65E-07
-3.90E-07
-3.34E-07
2.35E-08
-2.70E-07
-3.99E-07
-3.35E-07
2.42E-08
-2.69E-07
-4.02E-07
-3.28E-07
2.29E-08
-2.65E-07
-3.91E-07
-3.15E-07 -3.28E-07 -3.36E-07 -3.42E-07 -3.57E-07 -3.56E-07 -3.32E-07
1.72E-08
1.82E-08
2.05E-08
2.10E-08
2.25E-08
2.22E-08
1.99E-08
-2.68E-07 -2.78E-07 -2.80E-07 -2.84E-07 -2.95E-07 -2.95E-07 -2.77E-07
-3.62E-07 -3.78E-07 -3.92E-07 -3.99E-07 -4.19E-07 -4.17E-07 -3.87E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
57
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= -15 V #2
(A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.26. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.26. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.16E-07
-2.94E-07
-2.85E-07
-3.41E-07
-3.30E-07
-2.75E-07
-3.15E-07
-3.44E-07
-3.08E-07
-3.23E-07
-3.02E-07
-2.97E-07
10
-3.20E-07
-3.00E-07
-2.90E-07
-3.48E-07
-3.35E-07
-2.88E-07
-3.26E-07
-3.58E-07
-3.20E-07
-3.37E-07
-3.01E-07
-2.97E-07
20
-3.25E-07
-3.03E-07
-2.92E-07
-3.53E-07
-3.39E-07
-2.94E-07
-3.32E-07
-3.69E-07
-3.25E-07
-3.49E-07
-2.99E-07
-2.95E-07
30
-3.27E-07
-3.04E-07
-2.94E-07
-3.53E-07
-3.41E-07
-2.99E-07
-3.37E-07
-3.78E-07
-3.32E-07
-3.55E-07
-2.98E-07
-2.93E-07
50
-3.33E-07
-3.12E-07
-2.98E-07
-3.61E-07
-3.51E-07
-3.12E-07
-3.54E-07
-3.98E-07
-3.48E-07
-3.70E-07
-2.98E-07
-2.93E-07
60
-3.33E-07
-3.12E-07
-2.98E-07
-3.60E-07
-3.51E-07
-3.11E-07
-3.52E-07
-3.97E-07
-3.46E-07
-3.68E-07
-2.97E-07
-2.93E-07
70
-3.27E-07
-3.05E-07
-2.93E-07
-3.55E-07
-3.41E-07
-2.91E-07
-3.30E-07
-3.67E-07
-3.23E-07
-3.40E-07
-2.97E-07
-2.93E-07
-3.13E-07
2.33E-08
-2.49E-07
-3.77E-07
-3.19E-07
2.41E-08
-2.53E-07
-3.85E-07
-3.22E-07
2.48E-08
-2.54E-07
-3.90E-07
-3.24E-07
2.47E-08
-2.56E-07
-3.91E-07
-3.31E-07
2.64E-08
-2.59E-07
-4.04E-07
-3.31E-07
2.61E-08
-2.59E-07
-4.02E-07
-3.24E-07
2.55E-08
-2.54E-07
-3.94E-07
-3.13E-07 -3.26E-07 -3.34E-07 -3.40E-07 -3.56E-07 -3.55E-07 -3.30E-07
2.51E-08
2.58E-08
2.78E-08
2.90E-08
3.15E-08
3.17E-08
2.76E-08
-2.44E-07 -2.55E-07 -2.58E-07 -2.61E-07 -2.70E-07 -2.68E-07 -2.55E-07
-3.82E-07 -3.97E-07 -4.10E-07 -4.20E-07 -4.43E-07 -4.42E-07 -4.06E-07
-7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
7.15E-07
7.65E-07
8.15E-07
8.15E-07
8.65E-07
8.65E-07
8.65E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
59
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1
(V/mV)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
7.00E+03
6.00E+03
5.00E+03
4.00E+03
3.00E+03
2.00E+03
1.00E+03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.27. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.27. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
6.90E+03
5.65E+03
6.58E+03
5.77E+03
7.44E+03
7.03E+03
5.82E+03
6.43E+03
4.51E+03
6.73E+03
5.61E+03
5.18E+03
10
6.23E+03
4.90E+03
6.18E+03
5.26E+03
5.88E+03
6.52E+03
5.80E+03
5.87E+03
4.21E+03
6.43E+03
5.70E+03
5.06E+03
20
5.92E+03
5.18E+03
5.93E+03
5.11E+03
6.65E+03
6.41E+03
5.65E+03
5.60E+03
4.25E+03
5.77E+03
4.56E+03
4.97E+03
30
5.81E+03
4.94E+03
5.78E+03
4.88E+03
5.93E+03
5.69E+03
5.47E+03
5.70E+03
4.16E+03
5.65E+03
5.57E+03
4.90E+03
50
5.67E+03
4.91E+03
5.74E+03
4.95E+03
5.55E+03
6.24E+03
4.89E+03
5.17E+03
3.75E+03
5.42E+03
5.50E+03
4.95E+03
60
5.67E+03
4.75E+03
5.78E+03
5.07E+03
5.91E+03
6.03E+03
5.18E+03
5.43E+03
4.16E+03
5.75E+03
4.75E+03
4.79E+03
70
5.79E+03
4.98E+03
5.79E+03
5.05E+03
6.22E+03
6.39E+03
5.28E+03
5.68E+03
3.81E+03
5.57E+03
5.53E+03
4.19E+03
6.47E+03
7.58E+02
8.55E+03
4.39E+03
5.69E+03
5.87E+02
7.30E+03
4.08E+03
5.76E+03
6.34E+02
7.49E+03
4.02E+03
5.47E+03
5.10E+02
6.87E+03
4.07E+03
5.36E+03
4.03E+02
6.47E+03
4.26E+03
5.44E+03
5.04E+02
6.82E+03
4.05E+03
5.56E+03
5.32E+02
7.02E+03
4.10E+03
6.10E+03 5.77E+03 5.54E+03 5.33E+03 5.09E+03 5.31E+03 5.34E+03
9.99E+02 9.26E+02 7.89E+02 6.64E+02 9.05E+02 7.18E+02 9.52E+02
8.84E+03 8.31E+03 7.70E+03 7.15E+03 7.58E+03 7.28E+03 7.95E+03
3.36E+03 3.23E+03 3.37E+03 3.51E+03 2.61E+03 3.34E+03 2.73E+03
1.00E+03 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
61
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2
(V/mV)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
8.00E+03
6.00E+03
4.00E+03
2.00E+03
0.00E+00
-2.00E+03
-4.00E+03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
A
l
168-hr
70
Figure 5.28. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.28. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
5.60E+03
4.82E+03
7.04E+03
5.45E+03
5.57E+03
5.58E+03
5.54E+03
4.78E+03
1.38E+04
5.72E+03
5.49E+03
5.59E+03
10
5.14E+03
4.44E+03
6.80E+03
5.35E+03
5.17E+03
5.24E+03
5.24E+03
4.79E+03
1.00E+04
6.12E+03
5.34E+03
5.54E+03
20
5.21E+03
4.41E+03
6.40E+03
5.15E+03
5.45E+03
4.92E+03
5.53E+03
4.72E+03
5.16E+03
5.67E+03
4.92E+03
5.57E+03
30
4.96E+03
4.32E+03
6.73E+03
4.78E+03
5.44E+03
4.98E+03
5.13E+03
4.70E+03
6.30E+03
5.35E+03
5.17E+03
5.50E+03
50
5.05E+03
4.19E+03
6.19E+03
5.07E+03
5.19E+03
4.64E+03
4.76E+03
4.38E+03
5.31E+03
4.80E+03
5.69E+03
5.51E+03
60
4.80E+03
4.35E+03
6.29E+03
5.12E+03
5.02E+03
4.49E+03
4.92E+03
4.19E+03
5.60E+03
5.24E+03
5.28E+03
5.33E+03
70
4.99E+03
4.20E+03
6.22E+03
5.02E+03
5.09E+03
4.72E+03
5.15E+03
4.98E+03
5.54E+03
5.47E+03
5.16E+03
5.58E+03
5.70E+03
8.13E+02
7.93E+03
3.47E+03
5.38E+03
8.68E+02
7.76E+03
3.00E+03
5.32E+03
7.18E+02
7.29E+03
3.35E+03
5.25E+03
9.23E+02
7.78E+03
2.71E+03
5.14E+03
7.09E+02
7.08E+03
3.19E+03
5.12E+03
7.21E+02
7.09E+03
3.14E+03
5.10E+03
7.22E+02
7.08E+03
3.12E+03
7.08E+03 6.28E+03 5.20E+03 5.29E+03 4.78E+03 4.89E+03 5.17E+03
3.77E+03 2.15E+03 4.00E+02 6.11E+02 3.41E+02 5.63E+02 3.41E+02
1.74E+04 1.22E+04 6.30E+03 6.96E+03 5.71E+03 6.43E+03 6.11E+03
-3.26E+03 3.92E+02 4.10E+03 3.61E+03 3.84E+03 3.35E+03 4.23E+03
1.00E+03 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
63
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1
(V/mV)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.29. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.29. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
2.22E+03
2.06E+03
2.32E+03
2.03E+03
2.21E+03
2.46E+03
2.12E+03
2.25E+03
1.57E+03
2.41E+03
1.99E+03
1.79E+03
10
2.03E+03
1.93E+03
2.19E+03
1.89E+03
2.16E+03
2.30E+03
2.07E+03
2.13E+03
1.50E+03
2.25E+03
2.00E+03
1.79E+03
20
2.02E+03
1.89E+03
2.17E+03
1.86E+03
2.10E+03
2.26E+03
2.01E+03
2.11E+03
1.47E+03
2.24E+03
2.00E+03
1.77E+03
30
2.00E+03
1.86E+03
2.12E+03
1.79E+03
2.05E+03
2.15E+03
2.01E+03
2.03E+03
1.42E+03
2.16E+03
2.01E+03
1.76E+03
50
1.93E+03
1.80E+03
2.09E+03
1.76E+03
2.00E+03
2.05E+03
1.84E+03
2.02E+03
1.47E+03
2.14E+03
2.00E+03
1.80E+03
60
1.93E+03
1.81E+03
2.07E+03
1.75E+03
2.00E+03
2.06E+03
1.89E+03
2.00E+03
1.42E+03
2.04E+03
1.98E+03
1.93E+03
70
2.00E+03
1.85E+03
2.11E+03
1.80E+03
2.03E+03
2.23E+03
1.97E+03
2.06E+03
1.48E+03
2.16E+03
2.02E+03
1.78E+03
2.17E+03
1.22E+02
2.50E+03
1.83E+03
2.04E+03
1.34E+02
2.40E+03
1.67E+03
2.01E+03
1.32E+02
2.37E+03
1.64E+03
1.97E+03
1.37E+02
2.34E+03
1.59E+03
1.92E+03
1.38E+02
2.30E+03
1.54E+03
1.91E+03
1.31E+02
2.27E+03
1.55E+03
1.96E+03
1.31E+02
2.32E+03
1.60E+03
2.16E+03 2.05E+03 2.02E+03 1.95E+03 1.90E+03 1.88E+03 1.98E+03
3.58E+02 3.20E+02 3.21E+02 3.05E+02 2.66E+02 2.68E+02 2.96E+02
3.14E+03 2.93E+03 2.90E+03 2.79E+03 2.63E+03 2.61E+03 2.79E+03
1.18E+03 1.17E+03 1.14E+03 1.12E+03 1.18E+03 1.14E+03 1.17E+03
5.00E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
65
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2
(V/mV)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.30. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.30. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
2.13E+03
1.85E+03
2.66E+03
2.22E+03
2.13E+03
2.10E+03
2.12E+03
2.02E+03
2.31E+03
2.14E+03
2.11E+03
1.98E+03
10
2.00E+03
1.71E+03
2.44E+03
2.07E+03
2.08E+03
1.95E+03
2.07E+03
2.08E+03
2.26E+03
2.05E+03
2.07E+03
2.07E+03
20
1.94E+03
1.69E+03
2.39E+03
1.94E+03
2.03E+03
2.02E+03
2.03E+03
1.89E+03
2.32E+03
2.08E+03
2.04E+03
2.07E+03
30
1.94E+03
1.69E+03
2.40E+03
1.98E+03
2.02E+03
1.96E+03
2.00E+03
1.64E+03
2.00E+03
2.07E+03
2.03E+03
2.21E+03
50
1.89E+03
1.60E+03
2.37E+03
1.90E+03
1.98E+03
1.81E+03
1.96E+03
1.59E+03
1.96E+03
1.80E+03
2.01E+03
2.08E+03
60
1.92E+03
1.64E+03
2.34E+03
1.91E+03
1.89E+03
1.80E+03
1.93E+03
1.69E+03
2.04E+03
1.99E+03
2.16E+03
2.07E+03
70
1.90E+03
1.62E+03
2.36E+03
1.96E+03
1.96E+03
1.85E+03
1.96E+03
1.80E+03
2.12E+03
2.01E+03
2.06E+03
2.08E+03
2.20E+03
2.93E+02
3.00E+03
1.39E+03
2.06E+03
2.60E+02
2.77E+03
1.35E+03
2.00E+03
2.55E+02
2.70E+03
1.30E+03
2.00E+03
2.57E+02
2.71E+03
1.30E+03
1.95E+03
2.76E+02
2.70E+03
1.19E+03
1.94E+03
2.49E+02
2.62E+03
1.26E+03
1.96E+03
2.64E+02
2.68E+03
1.23E+03
2.14E+03 2.08E+03 2.07E+03 1.93E+03 1.82E+03 1.89E+03 1.95E+03
1.04E+02 1.12E+02 1.59E+02 1.71E+02 1.53E+02 1.45E+02 1.27E+02
2.42E+03 2.39E+03 2.50E+03 2.40E+03 2.24E+03 2.28E+03 2.30E+03
1.85E+03 1.78E+03 1.63E+03 1.46E+03 1.40E+03 1.49E+03 1.60E+03
5.00E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
67
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/15 V #1 (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.31. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.31. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.06E+02
1.10E+02
1.12E+02
1.04E+02
1.06E+02
1.06E+02
1.15E+02
1.01E+02
1.05E+02
1.09E+02
1.10E+02
9.94E+01
10
1.06E+02
1.10E+02
1.13E+02
1.04E+02
1.06E+02
1.06E+02
1.15E+02
1.01E+02
1.05E+02
1.08E+02
1.10E+02
9.94E+01
20
1.06E+02
1.10E+02
1.13E+02
1.04E+02
1.06E+02
1.06E+02
1.14E+02
1.01E+02
1.05E+02
1.08E+02
1.10E+02
9.94E+01
30
1.06E+02
1.09E+02
1.14E+02
1.04E+02
1.07E+02
1.06E+02
1.14E+02
1.01E+02
1.05E+02
1.08E+02
1.10E+02
9.94E+01
50
1.06E+02
1.09E+02
1.15E+02
1.04E+02
1.07E+02
1.06E+02
1.14E+02
1.01E+02
1.05E+02
1.07E+02
1.10E+02
9.94E+01
60
1.06E+02
1.09E+02
1.14E+02
1.04E+02
1.06E+02
1.06E+02
1.14E+02
1.01E+02
1.05E+02
1.07E+02
1.10E+02
9.93E+01
70
1.07E+02
1.08E+02
1.17E+02
1.03E+02
1.06E+02
1.06E+02
1.13E+02
1.00E+02
1.05E+02
1.08E+02
1.10E+02
9.94E+01
1.08E+02
3.40E+00
1.17E+02
9.84E+01
1.08E+02
3.43E+00
1.17E+02
9.84E+01
1.08E+02
3.51E+00
1.18E+02
9.84E+01
1.08E+02
3.89E+00
1.19E+02
9.75E+01
1.08E+02
4.00E+00
1.19E+02
9.73E+01
1.08E+02
3.89E+00
1.19E+02
9.75E+01
1.08E+02
5.35E+00
1.23E+02
9.38E+01
1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.06E+02
5.09E+00 5.01E+00 4.88E+00 4.89E+00 4.68E+00 4.76E+00 4.49E+00
1.21E+02 1.21E+02 1.20E+02 1.20E+02 1.19E+02 1.20E+02 1.19E+02
9.31E+01 9.32E+01 9.34E+01 9.34E+01 9.38E+01 9.36E+01 9.41E+01
9.00E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
69
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/15 V #2 (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.32. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.32. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.07E+02
9.90E+01
1.01E+02
1.13E+02
1.02E+02
1.02E+02
1.05E+02
1.01E+02
1.01E+02
1.03E+02
9.82E+01
1.14E+02
10
1.07E+02
9.90E+01
1.01E+02
1.13E+02
1.02E+02
1.02E+02
1.05E+02
1.01E+02
1.01E+02
1.03E+02
9.82E+01
1.14E+02
20
1.07E+02
9.89E+01
1.01E+02
1.14E+02
1.02E+02
1.02E+02
1.05E+02
1.01E+02
1.01E+02
1.03E+02
9.82E+01
1.15E+02
30
1.07E+02
9.89E+01
1.01E+02
1.14E+02
1.02E+02
1.02E+02
1.04E+02
1.01E+02
1.01E+02
1.03E+02
9.82E+01
1.15E+02
50
1.07E+02
9.89E+01
1.01E+02
1.15E+02
1.02E+02
1.02E+02
1.05E+02
1.01E+02
1.01E+02
1.03E+02
9.82E+01
1.14E+02
60
1.07E+02
9.89E+01
1.01E+02
1.15E+02
1.02E+02
1.02E+02
1.04E+02
1.01E+02
1.01E+02
1.03E+02
9.81E+01
1.15E+02
70
1.06E+02
9.83E+01
1.01E+02
1.17E+02
1.01E+02
1.02E+02
1.04E+02
1.01E+02
1.01E+02
1.02E+02
9.81E+01
1.14E+02
1.05E+02
5.76E+00
1.20E+02
8.88E+01
1.04E+02
5.85E+00
1.21E+02
8.84E+01
1.05E+02
6.04E+00
1.21E+02
8.80E+01
1.05E+02
6.15E+00
1.21E+02
8.78E+01
1.05E+02
6.37E+00
1.22E+02
8.72E+01
1.05E+02
6.33E+00
1.22E+02
8.73E+01
1.05E+02
7.58E+00
1.26E+02
8.40E+01
1.03E+02 1.02E+02 1.02E+02 1.02E+02 1.02E+02 1.02E+02 1.02E+02
1.61E+00 1.51E+00 1.47E+00 1.40E+00 1.41E+00 1.35E+00 1.05E+00
1.07E+02 1.07E+02 1.06E+02 1.06E+02 1.06E+02 1.06E+02 1.05E+02
9.81E+01 9.82E+01 9.83E+01 9.85E+01 9.84E+01 9.86E+01 9.90E+01
9.00E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
71
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching @ +/- 15 V,
VCM=+/- 15 V (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.33. Plot of Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB) versus total
dose. The solid diamonds are the average of the measured data points for the samples irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the samples
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.33. Raw data for Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15
V (dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.23E+02
1.02E+02
1.04E+02
1.08E+02
1.11E+02
1.11E+02
1.08E+02
1.32E+02
1.10E+02
1.10E+02
1.01E+02
1.01E+02
10
1.25E+02
1.02E+02
1.03E+02
1.08E+02
1.10E+02
1.11E+02
1.08E+02
1.30E+02
1.09E+02
1.10E+02
1.01E+02
1.01E+02
20
1.27E+02
1.02E+02
1.03E+02
1.08E+02
1.10E+02
1.11E+02
1.08E+02
1.25E+02
1.09E+02
1.10E+02
1.01E+02
1.01E+02
30
1.26E+02
1.02E+02
1.03E+02
1.08E+02
1.10E+02
1.11E+02
1.08E+02
1.25E+02
1.09E+02
1.10E+02
1.01E+02
1.01E+02
50
1.29E+02
1.02E+02
1.03E+02
1.07E+02
1.10E+02
1.10E+02
1.08E+02
1.22E+02
1.09E+02
1.10E+02
1.01E+02
1.01E+02
60
1.30E+02
1.02E+02
1.03E+02
1.08E+02
1.10E+02
1.10E+02
1.08E+02
1.22E+02
1.09E+02
1.10E+02
1.01E+02
1.01E+02
70
1.24E+02
1.02E+02
1.02E+02
1.05E+02
1.08E+02
1.10E+02
1.07E+02
1.26E+02
1.10E+02
1.08E+02
1.01E+02
1.01E+02
1.10E+02
8.44E+00
1.33E+02
8.64E+01
1.10E+02
9.26E+00
1.35E+02
8.43E+01
1.10E+02
1.00E+01
1.37E+02
8.25E+01
1.10E+02
9.84E+00
1.37E+02
8.27E+01
1.10E+02
1.12E+01
1.41E+02
7.97E+01
1.11E+02
1.14E+01
1.42E+02
7.92E+01
1.08E+02
9.19E+00
1.34E+02
8.32E+01
1.14E+02 1.14E+02 1.13E+02 1.12E+02 1.12E+02 1.12E+02 1.12E+02
9.78E+00 9.06E+00 6.90E+00 6.94E+00 5.82E+00 5.82E+00 7.61E+00
1.41E+02 1.38E+02 1.32E+02 1.32E+02 1.28E+02 1.28E+02 1.33E+02
8.74E+01 8.87E+01 9.37E+01 9.35E+01 9.61E+01 9.61E+01 9.11E+01
8.40E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
73
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1
(dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.34. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.34. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.52E+02
1.08E+02
10
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.52E+02
1.08E+02
20
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.55E+02
1.08E+02
30
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.53E+02
1.08E+02
50
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.51E+02
1.08E+02
60
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.51E+02
1.08E+02
70
1.05E+02
1.10E+02
1.03E+02
1.06E+02
1.10E+02
1.09E+02
1.18E+02
1.10E+02
1.01E+02
1.13E+02
1.49E+02
1.08E+02
1.07E+02
2.96E+00
1.15E+02
9.88E+01
1.07E+02
2.97E+00
1.15E+02
9.88E+01
1.07E+02
3.01E+00
1.15E+02
9.87E+01
1.07E+02
3.05E+00
1.15E+02
9.85E+01
1.07E+02
3.08E+00
1.15E+02
9.84E+01
1.07E+02
3.07E+00
1.15E+02
9.85E+01
1.07E+02
3.11E+00
1.15E+02
9.83E+01
1.10E+02 1.10E+02 1.10E+02 1.10E+02 1.10E+02 1.10E+02 1.10E+02
6.30E+00 6.30E+00 6.30E+00 6.33E+00 6.32E+00 6.36E+00 6.31E+00
1.27E+02 1.27E+02 1.27E+02 1.27E+02 1.27E+02 1.28E+02 1.27E+02
9.28E+01 9.28E+01 9.28E+01 9.27E+01 9.27E+01 9.27E+01 9.27E+01
9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
75
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2
(dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.35. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
76
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.35. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.18E+02
1.03E+02
9.86E+01
1.06E+02
1.10E+02
1.17E+02
1.12E+02
1.10E+02
1.02E+02
1.06E+02
1.14E+02
1.04E+02
10
1.18E+02
1.03E+02
9.86E+01
1.06E+02
1.10E+02
1.17E+02
1.12E+02
1.10E+02
1.02E+02
1.06E+02
1.14E+02
1.04E+02
20
1.18E+02
1.03E+02
9.85E+01
1.06E+02
1.10E+02
1.17E+02
1.12E+02
1.09E+02
1.01E+02
1.06E+02
1.14E+02
1.04E+02
30
1.18E+02
1.03E+02
9.85E+01
1.06E+02
1.10E+02
1.16E+02
1.12E+02
1.09E+02
1.01E+02
1.06E+02
1.14E+02
1.04E+02
50
1.18E+02
1.03E+02
9.85E+01
1.06E+02
1.10E+02
1.17E+02
1.12E+02
1.09E+02
1.01E+02
1.06E+02
1.14E+02
1.04E+02
60
1.18E+02
1.03E+02
9.85E+01
1.06E+02
1.10E+02
1.16E+02
1.12E+02
1.09E+02
1.01E+02
1.06E+02
1.14E+02
1.04E+02
70
1.18E+02
1.03E+02
9.85E+01
1.06E+02
1.10E+02
1.16E+02
1.12E+02
1.09E+02
1.01E+02
1.06E+02
1.14E+02
1.04E+02
1.07E+02
7.37E+00
1.27E+02
8.70E+01
1.07E+02
7.31E+00
1.27E+02
8.71E+01
1.07E+02
7.30E+00
1.27E+02
8.71E+01
1.07E+02
7.31E+00
1.27E+02
8.70E+01
1.07E+02
7.27E+00
1.27E+02
8.71E+01
1.07E+02
7.26E+00
1.27E+02
8.71E+01
1.07E+02
7.29E+00
1.27E+02
8.70E+01
1.09E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02
5.84E+00 5.87E+00 5.80E+00 5.73E+00 5.78E+00 5.71E+00 5.67E+00
1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.24E+02
9.32E+01 9.31E+01 9.32E+01 9.32E+01 9.32E+01 9.33E+01 9.34E+01
9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
77
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio Matching @ +/- 2 V to
+/- 16 V (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.36. Plot of Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
78
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.36. Raw data for Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.03E+02
1.00E+02
1.06E+02
1.30E+02
1.51E+02
1.14E+02
1.18E+02
1.04E+02
9.51E+01
1.11E+02
1.14E+02
9.94E+01
10
1.03E+02
1.00E+02
1.06E+02
1.30E+02
1.48E+02
1.13E+02
1.18E+02
1.04E+02
9.51E+01
1.11E+02
1.14E+02
9.94E+01
20
1.03E+02
1.00E+02
1.06E+02
1.29E+02
1.54E+02
1.13E+02
1.18E+02
1.04E+02
9.50E+01
1.11E+02
1.14E+02
9.94E+01
30
1.03E+02
1.00E+02
1.06E+02
1.29E+02
1.49E+02
1.14E+02
1.18E+02
1.04E+02
9.50E+01
1.10E+02
1.14E+02
9.94E+01
50
1.03E+02
1.00E+02
1.06E+02
1.28E+02
1.52E+02
1.13E+02
1.18E+02
1.04E+02
9.50E+01
1.11E+02
1.14E+02
9.94E+01
60
1.03E+02
1.00E+02
1.06E+02
1.28E+02
1.98E+02
1.14E+02
1.18E+02
1.04E+02
9.50E+01
1.10E+02
1.14E+02
9.94E+01
70
1.03E+02
1.00E+02
1.06E+02
1.31E+02
1.52E+02
1.14E+02
1.18E+02
1.04E+02
9.50E+01
1.10E+02
1.14E+02
9.94E+01
1.18E+02
2.18E+01
1.78E+02
5.84E+01
1.17E+02
2.08E+01
1.74E+02
6.06E+01
1.19E+02
2.28E+01
1.81E+02
5.60E+01
1.18E+02
2.11E+01
1.75E+02
5.97E+01
1.18E+02
2.18E+01
1.78E+02
5.80E+01
1.27E+02
4.13E+01
2.40E+02
1.40E+01
1.19E+02
2.25E+01
1.80E+02
5.70E+01
1.08E+02 1.08E+02 1.08E+02 1.08E+02 1.08E+02 1.08E+02 1.08E+02
9.11E+00 9.10E+00 9.07E+00 9.00E+00 9.03E+00 8.99E+00 9.03E+00
1.33E+02 1.33E+02 1.33E+02 1.33E+02 1.33E+02 1.33E+02 1.33E+02
8.33E+01 8.33E+01 8.33E+01 8.34E+01 8.34E+01 8.35E+01 8.34E+01
8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
79
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.37. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.37. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.88E-03
2.89E-03
3.05E-03
2.73E-03
3.01E-03
2.88E-03
2.93E-03
2.83E-03
2.74E-03
3.11E-03
2.81E-03
2.86E-03
10
2.93E-03
2.74E-03
3.11E-03
2.86E-03
3.16E-03
3.20E-03
3.11E-03
3.01E-03
2.94E-03
3.15E-03
2.89E-03
3.13E-03
20
3.18E-03
2.98E-03
3.21E-03
3.13E-03
3.31E-03
3.20E-03
3.13E-03
3.13E-03
3.05E-03
3.30E-03
2.84E-03
2.96E-03
30
3.26E-03
2.99E-03
3.31E-03
2.80E-03
3.23E-03
3.11E-03
3.11E-03
3.14E-03
2.89E-03
3.18E-03
2.87E-03
3.01E-03
50
3.32E-03
2.90E-03
3.44E-03
3.00E-03
3.35E-03
3.20E-03
3.30E-03
3.28E-03
3.17E-03
3.40E-03
2.86E-03
2.86E-03
60
3.29E-03
2.97E-03
3.46E-03
3.09E-03
3.29E-03
3.44E-03
3.36E-03
3.19E-03
3.00E-03
3.49E-03
2.99E-03
3.04E-03
70
3.10E-03
3.00E-03
3.20E-03
2.93E-03
3.30E-03
3.19E-03
3.12E-03
3.13E-03
2.92E-03
3.20E-03
2.92E-03
3.10E-03
2.91E-03
1.26E-04
3.26E-03
2.57E-03
2.96E-03
1.74E-04
3.44E-03
2.48E-03
3.16E-03
1.21E-04
3.49E-03
2.83E-03
3.12E-03
2.16E-04
3.71E-03
2.53E-03
3.20E-03
2.37E-04
3.85E-03
2.55E-03
3.22E-03
1.92E-04
3.75E-03
2.69E-03
3.11E-03
1.49E-04
3.51E-03
2.70E-03
2.90E-03
3.08E-03
3.16E-03
3.09E-03
3.27E-03
3.30E-03
3.11E-03
1.38E-04
1.06E-04
9.36E-05
1.13E-04
9.06E-05
2.01E-04
1.13E-04
3.28E-03
3.37E-03
3.42E-03
3.40E-03
3.52E-03
3.85E-03
3.42E-03
2.52E-03
2.79E-03
2.91E-03
2.78E-03
3.02E-03
2.75E-03
2.80E-03
1.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
81
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.38. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
82
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.38. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.86E-03
2.59E-03
2.96E-03
2.66E-03
3.16E-03
3.21E-03
2.91E-03
2.66E-03
2.74E-03
2.93E-03
2.79E-03
2.91E-03
10
3.01E-03
2.74E-03
3.10E-03
2.89E-03
3.06E-03
3.13E-03
3.10E-03
2.98E-03
2.96E-03
3.18E-03
3.01E-03
2.98E-03
20
3.20E-03
2.79E-03
3.18E-03
3.20E-03
3.26E-03
3.25E-03
3.15E-03
3.11E-03
2.93E-03
3.23E-03
2.98E-03
2.96E-03
30
3.28E-03
2.86E-03
3.31E-03
2.96E-03
3.36E-03
3.33E-03
3.12E-03
2.99E-03
2.99E-03
3.29E-03
2.92E-03
2.89E-03
50
3.32E-03
2.88E-03
3.27E-03
3.18E-03
3.42E-03
3.22E-03
3.08E-03
3.28E-03
3.03E-03
3.42E-03
2.95E-03
2.86E-03
60
3.32E-03
2.95E-03
3.37E-03
3.31E-03
3.49E-03
3.47E-03
3.31E-03
3.36E-03
3.07E-03
3.41E-03
2.95E-03
2.94E-03
70
3.15E-03
2.92E-03
3.35E-03
3.08E-03
3.24E-03
3.32E-03
3.20E-03
3.05E-03
2.97E-03
3.27E-03
2.97E-03
3.02E-03
2.85E-03
2.30E-04
3.48E-03
2.21E-03
2.96E-03
1.46E-04
3.36E-03
2.56E-03
3.13E-03
1.90E-04
3.65E-03
2.60E-03
3.15E-03
2.27E-04
3.78E-03
2.53E-03
3.21E-03
2.06E-04
3.78E-03
2.65E-03
3.29E-03
2.02E-04
3.84E-03
2.73E-03
3.15E-03
1.63E-04
3.59E-03
2.70E-03
2.89E-03
3.07E-03
3.13E-03
3.14E-03
3.21E-03
3.32E-03
3.16E-03
2.12E-04
9.59E-05
1.28E-04
1.61E-04
1.57E-04
1.54E-04
1.48E-04
3.47E-03
3.33E-03
3.48E-03
3.59E-03
3.64E-03
3.75E-03
3.57E-03
2.31E-03
2.81E-03
2.78E-03
2.70E-03
2.78E-03
2.90E-03
2.76E-03
1.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
83
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.39. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
84
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.39. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
6.50E-02
6.19E-02
6.71E-02
6.17E-02
6.73E-02
6.72E-02
6.45E-02
6.43E-02
6.26E-02
6.71E-02
6.53E-02
6.64E-02
10
6.65E-02
6.32E-02
6.86E-02
6.28E-02
6.85E-02
6.77E-02
6.55E-02
6.49E-02
6.31E-02
6.78E-02
6.54E-02
6.64E-02
20
6.71E-02
6.37E-02
6.93E-02
6.38E-02
6.94E-02
6.86E-02
6.58E-02
6.56E-02
6.39E-02
6.83E-02
6.56E-02
6.66E-02
30
6.79E-02
6.46E-02
7.00E-02
6.42E-02
7.00E-02
6.89E-02
6.64E-02
6.58E-02
6.41E-02
6.87E-02
6.56E-02
6.69E-02
50
6.83E-02
6.46E-02
7.05E-02
6.47E-02
7.06E-02
6.94E-02
6.66E-02
6.64E-02
6.45E-02
6.95E-02
6.59E-02
6.71E-02
60
6.82E-02
6.48E-02
7.03E-02
6.47E-02
7.03E-02
6.94E-02
6.66E-02
6.65E-02
6.45E-02
6.96E-02
6.59E-02
6.68E-02
70
6.78E-02
6.48E-02
7.01E-02
6.44E-02
7.03E-02
6.91E-02
6.63E-02
6.60E-02
6.43E-02
6.89E-02
6.60E-02
6.71E-02
6.46E-02
2.71E-03
7.20E-02
5.72E-02
6.59E-02
2.79E-03
7.36E-02
5.82E-02
6.67E-02
2.82E-03
7.44E-02
5.89E-02
6.73E-02
2.82E-03
7.51E-02
5.96E-02
6.78E-02
2.96E-03
7.59E-02
5.97E-02
6.77E-02
2.78E-03
7.53E-02
6.00E-02
6.75E-02
2.82E-03
7.52E-02
5.97E-02
6.51E-02
6.58E-02
6.64E-02
6.68E-02
6.73E-02
6.73E-02
6.69E-02
1.99E-03
2.00E-03
1.97E-03
2.05E-03
2.15E-03
2.15E-03
2.04E-03
7.06E-02
7.13E-02
7.19E-02
7.24E-02
7.32E-02
7.32E-02
7.25E-02
5.97E-02
6.03E-02
6.10E-02
6.12E-02
6.14E-02
6.14E-02
6.13E-02
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
85
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.40. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.40. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
6.48E-02
6.06E-02
6.68E-02
6.14E-02
6.72E-02
6.78E-02
6.44E-02
6.35E-02
6.28E-02
6.64E-02
6.55E-02
6.60E-02
10
6.65E-02
6.19E-02
6.81E-02
6.27E-02
6.87E-02
6.85E-02
6.50E-02
6.41E-02
6.33E-02
6.72E-02
6.57E-02
6.60E-02
20
6.70E-02
6.26E-02
6.89E-02
6.33E-02
6.94E-02
6.89E-02
6.57E-02
6.45E-02
6.39E-02
6.79E-02
6.59E-02
6.64E-02
30
6.76E-02
6.32E-02
6.95E-02
6.40E-02
7.02E-02
6.94E-02
6.61E-02
6.51E-02
6.42E-02
6.84E-02
6.62E-02
6.66E-02
50
6.80E-02
6.33E-02
6.99E-02
6.46E-02
7.07E-02
6.96E-02
6.65E-02
6.55E-02
6.48E-02
6.86E-02
6.62E-02
6.66E-02
60
6.80E-02
6.34E-02
7.02E-02
6.46E-02
7.08E-02
6.97E-02
6.64E-02
6.56E-02
6.48E-02
6.90E-02
6.61E-02
6.66E-02
70
6.78E-02
6.33E-02
6.99E-02
6.41E-02
7.05E-02
6.92E-02
6.61E-02
6.48E-02
6.44E-02
6.84E-02
6.63E-02
6.67E-02
6.42E-02
3.02E-03
7.24E-02
5.59E-02
6.56E-02
3.13E-03
7.42E-02
5.70E-02
6.62E-02
3.15E-03
7.49E-02
5.76E-02
6.69E-02
3.15E-03
7.56E-02
5.83E-02
6.73E-02
3.24E-03
7.62E-02
5.84E-02
6.74E-02
3.30E-03
7.65E-02
5.83E-02
6.71E-02
3.29E-03
7.61E-02
5.81E-02
6.50E-02
6.56E-02
6.62E-02
6.66E-02
6.70E-02
6.71E-02
6.66E-02
2.06E-03
2.15E-03
2.16E-03
2.19E-03
2.03E-03
2.13E-03
2.16E-03
7.06E-02
7.15E-02
7.21E-02
7.26E-02
7.26E-02
7.29E-02
7.25E-02
5.93E-02
5.97E-02
6.03E-02
6.06E-02
6.14E-02
6.13E-02
6.07E-02
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
87
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 10 mA @ +/- 15 V #1
(V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.41. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.41. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.16E-01
3.07E-01
3.24E-01
3.03E-01
3.25E-01
3.27E-01
3.15E-01
3.14E-01
3.07E-01
3.24E-01
3.19E-01
3.23E-01
10
3.20E-01
3.10E-01
3.28E-01
3.07E-01
3.29E-01
3.30E-01
3.18E-01
3.16E-01
3.09E-01
3.28E-01
3.20E-01
3.24E-01
20
3.22E-01
3.12E-01
3.30E-01
3.09E-01
3.31E-01
3.32E-01
3.20E-01
3.18E-01
3.12E-01
3.30E-01
3.22E-01
3.25E-01
30
3.24E-01
3.15E-01
3.32E-01
3.11E-01
3.34E-01
3.35E-01
3.22E-01
3.21E-01
3.13E-01
3.32E-01
3.23E-01
3.26E-01
50
3.25E-01
3.16E-01
3.34E-01
3.12E-01
3.36E-01
3.36E-01
3.24E-01
3.22E-01
3.15E-01
3.34E-01
3.23E-01
3.26E-01
60
3.26E-01
3.16E-01
3.34E-01
3.12E-01
3.36E-01
3.36E-01
3.23E-01
3.23E-01
3.15E-01
3.34E-01
3.23E-01
3.26E-01
70
3.25E-01
3.15E-01
3.33E-01
3.11E-01
3.35E-01
3.34E-01
3.22E-01
3.20E-01
3.13E-01
3.32E-01
3.23E-01
3.26E-01
3.15E-01
9.85E-03
3.42E-01
2.88E-01
3.19E-01
9.91E-03
3.46E-01
2.91E-01
3.21E-01
1.03E-02
3.49E-01
2.93E-01
3.23E-01
1.00E-02
3.51E-01
2.96E-01
3.25E-01
1.04E-02
3.53E-01
2.96E-01
3.25E-01
1.05E-02
3.54E-01
2.96E-01
3.24E-01
1.05E-02
3.53E-01
2.95E-01
3.18E-01
3.20E-01
3.22E-01
3.24E-01
3.26E-01
3.26E-01
3.24E-01
8.06E-03
8.42E-03
8.38E-03
8.88E-03
8.77E-03
8.65E-03
8.64E-03
3.40E-01
3.43E-01
3.45E-01
3.49E-01
3.50E-01
3.50E-01
3.48E-01
2.95E-01
2.97E-01
2.99E-01
3.00E-01
3.02E-01
3.03E-01
3.01E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
89
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 10 mA @ +/- 15 V #2
(V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.42. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.42. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.16E-01
3.03E-01
3.23E-01
3.03E-01
3.26E-01
3.29E-01
3.15E-01
3.11E-01
3.08E-01
3.22E-01
3.21E-01
3.22E-01
10
3.20E-01
3.05E-01
3.26E-01
3.06E-01
3.29E-01
3.31E-01
3.17E-01
3.14E-01
3.10E-01
3.25E-01
3.22E-01
3.22E-01
20
3.22E-01
3.07E-01
3.29E-01
3.08E-01
3.32E-01
3.34E-01
3.19E-01
3.16E-01
3.13E-01
3.27E-01
3.23E-01
3.24E-01
30
3.24E-01
3.10E-01
3.31E-01
3.10E-01
3.34E-01
3.36E-01
3.21E-01
3.18E-01
3.14E-01
3.30E-01
3.24E-01
3.25E-01
50
3.25E-01
3.11E-01
3.33E-01
3.12E-01
3.36E-01
3.38E-01
3.23E-01
3.20E-01
3.15E-01
3.31E-01
3.24E-01
3.25E-01
60
3.25E-01
3.11E-01
3.33E-01
3.12E-01
3.36E-01
3.38E-01
3.23E-01
3.20E-01
3.15E-01
3.32E-01
3.24E-01
3.25E-01
70
3.25E-01
3.10E-01
3.32E-01
3.11E-01
3.35E-01
3.36E-01
3.21E-01
3.18E-01
3.14E-01
3.29E-01
3.24E-01
3.25E-01
3.14E-01
1.08E-02
3.44E-01
2.84E-01
3.17E-01
1.12E-02
3.48E-01
2.86E-01
3.19E-01
1.14E-02
3.51E-01
2.88E-01
3.22E-01
1.14E-02
3.53E-01
2.91E-01
3.23E-01
1.17E-02
3.55E-01
2.91E-01
3.23E-01
1.17E-02
3.55E-01
2.91E-01
3.23E-01
1.16E-02
3.54E-01
2.91E-01
3.17E-01
3.19E-01
3.22E-01
3.24E-01
3.26E-01
3.25E-01
3.24E-01
8.44E-03
8.73E-03
8.70E-03
9.07E-03
9.05E-03
9.03E-03
8.72E-03
3.40E-01
3.43E-01
3.46E-01
3.49E-01
3.50E-01
3.50E-01
3.48E-01
2.94E-01
2.95E-01
2.98E-01
2.99E-01
3.01E-01
3.01E-01
3.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
8.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
91
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.43. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.43. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.90E-02
1.98E-02
2.01E-02
1.95E-02
1.81E-02
1.96E-02
1.94E-02
1.82E-02
1.92E-02
1.82E-02
1.88E-02
1.92E-02
10
1.94E-02
2.01E-02
2.05E-02
2.00E-02
1.86E-02
1.99E-02
1.99E-02
1.85E-02
1.96E-02
1.85E-02
1.91E-02
1.92E-02
20
1.98E-02
2.05E-02
2.06E-02
2.02E-02
1.88E-02
2.01E-02
2.01E-02
1.89E-02
1.97E-02
1.87E-02
1.91E-02
1.95E-02
30
1.97E-02
2.07E-02
2.10E-02
2.04E-02
1.90E-02
2.05E-02
2.04E-02
1.90E-02
1.99E-02
1.90E-02
1.92E-02
1.95E-02
50
2.00E-02
2.09E-02
2.10E-02
2.06E-02
1.90E-02
2.05E-02
2.05E-02
1.93E-02
2.01E-02
1.93E-02
1.93E-02
1.96E-02
60
2.00E-02
2.08E-02
2.10E-02
2.06E-02
1.91E-02
2.05E-02
2.03E-02
1.93E-02
2.01E-02
1.92E-02
1.94E-02
1.96E-02
70
2.00E-02
2.06E-02
2.10E-02
2.04E-02
1.90E-02
2.02E-02
2.02E-02
1.90E-02
1.98E-02
1.88E-02
1.93E-02
1.95E-02
1.93E-02
7.72E-04
2.14E-02
1.72E-02
1.97E-02
7.32E-04
2.17E-02
1.77E-02
2.00E-02
7.37E-04
2.20E-02
1.79E-02
2.02E-02
8.00E-04
2.24E-02
1.80E-02
2.03E-02
8.43E-04
2.26E-02
1.80E-02
2.03E-02
7.60E-04
2.24E-02
1.82E-02
2.02E-02
7.67E-04
2.23E-02
1.81E-02
1.89E-02
1.93E-02
1.95E-02
1.98E-02
1.99E-02
1.99E-02
1.96E-02
6.99E-04
7.25E-04
6.69E-04
6.93E-04
6.40E-04
5.85E-04
6.80E-04
2.08E-02
2.12E-02
2.13E-02
2.17E-02
2.17E-02
2.15E-02
2.15E-02
1.70E-02
1.73E-02
1.77E-02
1.79E-02
1.82E-02
1.83E-02
1.77E-02
3.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
93
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.44. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
94
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.44. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.94E-02
2.04E-02
2.05E-02
1.99E-02
1.81E-02
1.97E-02
1.98E-02
1.84E-02
1.96E-02
1.87E-02
1.90E-02
1.90E-02
10
1.99E-02
2.05E-02
2.09E-02
2.02E-02
1.85E-02
2.01E-02
2.01E-02
1.86E-02
1.96E-02
1.91E-02
1.93E-02
1.91E-02
20
1.99E-02
2.10E-02
2.12E-02
2.05E-02
1.87E-02
2.01E-02
2.04E-02
1.89E-02
2.01E-02
1.92E-02
1.94E-02
1.92E-02
30
2.04E-02
2.11E-02
2.13E-02
2.07E-02
1.90E-02
2.05E-02
2.06E-02
1.88E-02
2.02E-02
1.95E-02
1.97E-02
1.92E-02
50
2.03E-02
2.13E-02
2.16E-02
2.09E-02
1.92E-02
2.07E-02
2.07E-02
1.93E-02
2.05E-02
1.97E-02
1.97E-02
1.92E-02
60
2.04E-02
2.13E-02
2.14E-02
2.07E-02
1.92E-02
2.05E-02
2.08E-02
1.91E-02
2.04E-02
1.99E-02
1.95E-02
1.94E-02
70
2.02E-02
2.12E-02
2.13E-02
2.08E-02
1.90E-02
2.04E-02
2.05E-02
1.91E-02
2.00E-02
1.94E-02
1.95E-02
1.94E-02
1.97E-02
9.49E-04
2.23E-02
1.71E-02
2.00E-02
9.18E-04
2.25E-02
1.75E-02
2.03E-02
9.98E-04
2.30E-02
1.75E-02
2.05E-02
9.25E-04
2.30E-02
1.79E-02
2.07E-02
9.40E-04
2.32E-02
1.81E-02
2.06E-02
8.94E-04
2.31E-02
1.82E-02
2.05E-02
9.28E-04
2.30E-02
1.79E-02
1.92E-02
1.95E-02
1.97E-02
1.99E-02
2.02E-02
2.01E-02
1.99E-02
6.32E-04
6.45E-04
6.48E-04
7.36E-04
6.43E-04
6.68E-04
6.13E-04
2.10E-02
2.12E-02
2.15E-02
2.19E-02
2.19E-02
2.20E-02
2.15E-02
1.75E-02
1.77E-02
1.80E-02
1.79E-02
1.84E-02
1.83E-02
1.82E-02
3.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
95
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.45. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
96
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.45. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
5.36E-02
5.38E-02
5.43E-02
5.35E-02
5.23E-02
5.44E-02
5.36E-02
5.21E-02
5.32E-02
5.27E-02
5.32E-02
5.35E-02
10
5.43E-02
5.46E-02
5.46E-02
5.41E-02
5.27E-02
5.49E-02
5.38E-02
5.25E-02
5.36E-02
5.30E-02
5.32E-02
5.37E-02
20
5.45E-02
5.47E-02
5.51E-02
5.45E-02
5.31E-02
5.52E-02
5.40E-02
5.28E-02
5.40E-02
5.34E-02
5.35E-02
5.39E-02
30
5.50E-02
5.51E-02
5.52E-02
5.49E-02
5.35E-02
5.55E-02
5.45E-02
5.31E-02
5.40E-02
5.36E-02
5.38E-02
5.42E-02
50
5.50E-02
5.52E-02
5.56E-02
5.49E-02
5.37E-02
5.56E-02
5.47E-02
5.33E-02
5.41E-02
5.38E-02
5.38E-02
5.40E-02
60
5.50E-02
5.52E-02
5.54E-02
5.50E-02
5.37E-02
5.57E-02
5.48E-02
5.33E-02
5.44E-02
5.38E-02
5.38E-02
5.41E-02
70
5.51E-02
5.50E-02
5.54E-02
5.47E-02
5.36E-02
5.55E-02
5.45E-02
5.32E-02
5.41E-02
5.37E-02
5.38E-02
5.43E-02
5.35E-02
7.53E-04
5.56E-02
5.14E-02
5.40E-02
7.81E-04
5.62E-02
5.19E-02
5.44E-02
7.79E-04
5.65E-02
5.22E-02
5.47E-02
6.85E-04
5.66E-02
5.28E-02
5.49E-02
7.02E-04
5.68E-02
5.30E-02
5.49E-02
6.85E-04
5.67E-02
5.30E-02
5.48E-02
6.69E-04
5.66E-02
5.29E-02
5.32E-02
5.35E-02
5.39E-02
5.42E-02
5.43E-02
5.44E-02
5.42E-02
8.77E-04
9.06E-04
9.07E-04
9.32E-04
8.87E-04
9.34E-04
8.89E-04
5.56E-02
5.60E-02
5.64E-02
5.67E-02
5.67E-02
5.70E-02
5.66E-02
5.08E-02
5.11E-02
5.14E-02
5.16E-02
5.19E-02
5.18E-02
5.18E-02
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
97
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.46. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
98
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.46. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
5.42E-02
5.44E-02
5.49E-02
5.41E-02
5.27E-02
5.46E-02
5.41E-02
5.23E-02
5.38E-02
5.34E-02
5.35E-02
5.37E-02
10
5.48E-02
5.49E-02
5.55E-02
5.48E-02
5.30E-02
5.50E-02
5.44E-02
5.25E-02
5.40E-02
5.37E-02
5.37E-02
5.37E-02
20
5.49E-02
5.52E-02
5.59E-02
5.52E-02
5.35E-02
5.52E-02
5.48E-02
5.29E-02
5.46E-02
5.40E-02
5.39E-02
5.41E-02
30
5.54E-02
5.57E-02
5.60E-02
5.54E-02
5.36E-02
5.56E-02
5.50E-02
5.32E-02
5.47E-02
5.42E-02
5.40E-02
5.44E-02
50
5.54E-02
5.57E-02
5.63E-02
5.57E-02
5.39E-02
5.57E-02
5.52E-02
5.35E-02
5.47E-02
5.47E-02
5.40E-02
5.41E-02
60
5.56E-02
5.58E-02
5.63E-02
5.55E-02
5.39E-02
5.56E-02
5.54E-02
5.35E-02
5.49E-02
5.46E-02
5.40E-02
5.42E-02
70
5.55E-02
5.56E-02
5.61E-02
5.53E-02
5.40E-02
5.54E-02
5.51E-02
5.33E-02
5.47E-02
5.44E-02
5.41E-02
5.43E-02
5.40E-02
7.92E-04
5.62E-02
5.19E-02
5.46E-02
9.46E-04
5.72E-02
5.20E-02
5.49E-02
8.85E-04
5.74E-02
5.25E-02
5.52E-02
9.42E-04
5.78E-02
5.26E-02
5.54E-02
8.99E-04
5.78E-02
5.29E-02
5.54E-02
8.83E-04
5.78E-02
5.30E-02
5.53E-02
7.91E-04
5.75E-02
5.31E-02
5.37E-02
5.39E-02
5.43E-02
5.46E-02
5.48E-02
5.48E-02
5.46E-02
8.93E-04
9.03E-04
8.93E-04
9.03E-04
8.34E-04
8.53E-04
8.27E-04
5.61E-02
5.64E-02
5.67E-02
5.70E-02
5.70E-02
5.71E-02
5.68E-02
5.12E-02
5.14E-02
5.18E-02
5.21E-02
5.25E-02
5.25E-02
5.23E-02
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
99
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1
(V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.47. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.47. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.18E-01
2.17E-01
2.11E-01
2.17E-01
2.12E-01
2.16E-01
2.13E-01
2.11E-01
2.14E-01
2.13E-01
2.13E-01
2.13E-01
10
2.20E-01
2.18E-01
2.12E-01
2.18E-01
2.13E-01
2.17E-01
2.14E-01
2.12E-01
2.15E-01
2.14E-01
2.14E-01
2.14E-01
20
2.20E-01
2.19E-01
2.13E-01
2.19E-01
2.14E-01
2.18E-01
2.15E-01
2.13E-01
2.17E-01
2.15E-01
2.15E-01
2.14E-01
30
2.22E-01
2.21E-01
2.14E-01
2.20E-01
2.16E-01
2.19E-01
2.16E-01
2.14E-01
2.17E-01
2.16E-01
2.16E-01
2.16E-01
50
2.22E-01
2.20E-01
2.14E-01
2.21E-01
2.16E-01
2.19E-01
2.16E-01
2.14E-01
2.17E-01
2.17E-01
2.16E-01
2.15E-01
60
2.22E-01
2.21E-01
2.15E-01
2.21E-01
2.16E-01
2.19E-01
2.16E-01
2.14E-01
2.17E-01
2.17E-01
2.16E-01
2.15E-01
70
2.22E-01
2.20E-01
2.14E-01
2.20E-01
2.15E-01
2.20E-01
2.16E-01
2.14E-01
2.17E-01
2.16E-01
2.16E-01
2.15E-01
2.15E-01
3.07E-03
2.24E-01
2.07E-01
2.16E-01
3.25E-03
2.25E-01
2.07E-01
2.17E-01
3.18E-03
2.26E-01
2.08E-01
2.19E-01
3.34E-03
2.28E-01
2.09E-01
2.19E-01
3.26E-03
2.27E-01
2.10E-01
2.19E-01
3.21E-03
2.28E-01
2.10E-01
2.18E-01
3.46E-03
2.28E-01
2.09E-01
2.14E-01
2.14E-01
2.16E-01
2.16E-01
2.17E-01
2.17E-01
2.17E-01
1.75E-03
1.65E-03
1.83E-03
1.58E-03
1.76E-03
1.73E-03
1.92E-03
2.18E-01
2.19E-01
2.21E-01
2.21E-01
2.21E-01
2.22E-01
2.22E-01
2.09E-01
2.10E-01
2.11E-01
2.12E-01
2.12E-01
2.12E-01
2.11E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
101
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2
(V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.48. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.48. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.21E-01
2.19E-01
2.13E-01
2.20E-01
2.14E-01
2.17E-01
2.16E-01
2.13E-01
2.17E-01
2.16E-01
2.15E-01
2.15E-01
10
2.22E-01
2.20E-01
2.15E-01
2.21E-01
2.15E-01
2.18E-01
2.16E-01
2.14E-01
2.18E-01
2.17E-01
2.16E-01
2.16E-01
20
2.22E-01
2.21E-01
2.16E-01
2.22E-01
2.16E-01
2.19E-01
2.18E-01
2.15E-01
2.19E-01
2.18E-01
2.17E-01
2.17E-01
30
2.24E-01
2.23E-01
2.17E-01
2.23E-01
2.17E-01
2.21E-01
2.19E-01
2.16E-01
2.20E-01
2.19E-01
2.18E-01
2.18E-01
50
2.24E-01
2.22E-01
2.17E-01
2.23E-01
2.18E-01
2.20E-01
2.19E-01
2.16E-01
2.20E-01
2.18E-01
2.18E-01
2.18E-01
60
2.24E-01
2.22E-01
2.17E-01
2.23E-01
2.18E-01
2.21E-01
2.19E-01
2.16E-01
2.20E-01
2.19E-01
2.18E-01
2.18E-01
70
2.24E-01
2.22E-01
2.17E-01
2.23E-01
2.18E-01
2.21E-01
2.19E-01
2.16E-01
2.20E-01
2.19E-01
2.18E-01
2.18E-01
2.17E-01
3.29E-03
2.26E-01
2.08E-01
2.19E-01
3.31E-03
2.28E-01
2.10E-01
2.20E-01
3.09E-03
2.28E-01
2.11E-01
2.21E-01
3.42E-03
2.30E-01
2.12E-01
2.21E-01
3.27E-03
2.30E-01
2.12E-01
2.21E-01
3.16E-03
2.30E-01
2.12E-01
2.21E-01
3.25E-03
2.30E-01
2.12E-01
2.16E-01
2.17E-01
2.18E-01
2.19E-01
2.19E-01
2.19E-01
2.19E-01
1.47E-03
1.46E-03
1.56E-03
1.56E-03
1.65E-03
1.67E-03
1.66E-03
2.20E-01
2.21E-01
2.22E-01
2.23E-01
2.23E-01
2.24E-01
2.23E-01
2.12E-01
2.13E-01
2.14E-01
2.14E-01
2.14E-01
2.14E-01
2.14E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
5.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
103
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ +/- 15 V #1 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.49. Plot of Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
104
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.49. Raw data for Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ +/- 15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.89E-02
-4.17E-02
-3.28E-02
-3.82E-02
-3.77E-02
-3.66E-02
-3.66E-02
-3.85E-02
-4.07E-02
-3.71E-02
-3.98E-02
-3.68E-02
10
-3.83E-02
-4.10E-02
-3.22E-02
-3.75E-02
-3.70E-02
-3.61E-02
-3.62E-02
-3.80E-02
-4.03E-02
-3.67E-02
-3.99E-02
-3.69E-02
20
-3.81E-02
-4.07E-02
-3.22E-02
-3.73E-02
-3.68E-02
-3.60E-02
-3.62E-02
-3.79E-02
-4.04E-02
-3.65E-02
-4.03E-02
-3.73E-02
30
-3.82E-02
-4.09E-02
-3.22E-02
-3.74E-02
-3.68E-02
-3.60E-02
-3.62E-02
-3.78E-02
-4.03E-02
-3.65E-02
-4.06E-02
-3.76E-02
50
-3.76E-02
-4.03E-02
-3.17E-02
-3.69E-02
-3.63E-02
-3.55E-02
-3.57E-02
-3.71E-02
-3.98E-02
-3.58E-02
-4.06E-02
-3.76E-02
60
-3.75E-02
-4.03E-02
-3.17E-02
-3.69E-02
-3.63E-02
-3.55E-02
-3.58E-02
-3.72E-02
-3.99E-02
-3.59E-02
-4.06E-02
-3.77E-02
70
-3.80E-02
-4.06E-02
-3.20E-02
-3.73E-02
-3.65E-02
-3.62E-02
-3.65E-02
-3.81E-02
-4.05E-02
-3.68E-02
-4.07E-02
-3.77E-02
-3.78E-02
3.23E-03
-2.90E-02
-4.67E-02
-3.72E-02
3.20E-03
-2.85E-02
-4.60E-02
-3.70E-02
3.11E-03
-2.85E-02
-4.55E-02
-3.71E-02
3.14E-03
-2.85E-02
-4.57E-02
-3.65E-02
3.10E-03
-2.81E-02
-4.50E-02
-3.65E-02
3.10E-03
-2.80E-02
-4.50E-02
-3.69E-02
3.10E-03
-2.84E-02
-4.54E-02
-3.79E-02 -3.75E-02 -3.74E-02 -3.73E-02 -3.68E-02 -3.68E-02 -3.76E-02
1.74E-03
1.74E-03
1.83E-03
1.77E-03
1.81E-03
1.81E-03
1.75E-03
-3.31E-02 -3.27E-02 -3.24E-02 -3.25E-02 -3.18E-02 -3.19E-02 -3.28E-02
-4.27E-02 -4.22E-02 -4.24E-02 -4.22E-02 -4.17E-02 -4.18E-02 -4.24E-02
-1.50E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
105
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ +/- 15 V #2 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
-4.50E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.50. Plot of Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
106
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.50. Raw data for Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ +/- 15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.98E-02
-4.33E-02
-3.44E-02
-4.02E-02
-3.84E-02
-3.67E-02
-3.78E-02
-4.12E-02
-4.09E-02
-3.88E-02
-4.01E-02
-3.82E-02
10
-3.92E-02
-4.26E-02
-3.38E-02
-3.95E-02
-3.77E-02
-3.62E-02
-3.74E-02
-4.07E-02
-4.05E-02
-3.83E-02
-4.03E-02
-3.83E-02
20
-3.89E-02
-4.22E-02
-3.37E-02
-3.93E-02
-3.76E-02
-3.62E-02
-3.73E-02
-4.05E-02
-4.06E-02
-3.82E-02
-4.07E-02
-3.87E-02
30
-3.91E-02
-4.24E-02
-3.38E-02
-3.93E-02
-3.76E-02
-3.62E-02
-3.73E-02
-4.04E-02
-4.05E-02
-3.81E-02
-4.09E-02
-3.90E-02
50
-3.84E-02
-4.17E-02
-3.33E-02
-3.88E-02
-3.70E-02
-3.56E-02
-3.68E-02
-3.97E-02
-4.00E-02
-3.74E-02
-4.10E-02
-3.90E-02
60
-3.84E-02
-4.17E-02
-3.32E-02
-3.88E-02
-3.70E-02
-3.56E-02
-3.69E-02
-3.98E-02
-4.01E-02
-3.75E-02
-4.09E-02
-3.91E-02
70
-3.88E-02
-4.21E-02
-3.36E-02
-3.92E-02
-3.73E-02
-3.64E-02
-3.76E-02
-4.08E-02
-4.07E-02
-3.84E-02
-4.10E-02
-3.91E-02
-3.92E-02
3.23E-03
-3.04E-02
-4.81E-02
-3.85E-02
3.19E-03
-2.98E-02
-4.73E-02
-3.83E-02
3.10E-03
-2.99E-02
-4.68E-02
-3.84E-02
3.13E-03
-2.99E-02
-4.70E-02
-3.78E-02
3.09E-03
-2.93E-02
-4.63E-02
-3.78E-02
3.09E-03
-2.93E-02
-4.63E-02
-3.82E-02
3.09E-03
-2.97E-02
-4.66E-02
-3.91E-02 -3.86E-02 -3.85E-02 -3.85E-02 -3.79E-02 -3.80E-02 -3.88E-02
1.96E-03
1.95E-03
1.97E-03
1.91E-03
1.90E-03
1.91E-03
1.94E-03
-3.37E-02 -3.33E-02 -3.31E-02 -3.33E-02 -3.27E-02 -3.27E-02 -3.34E-02
-4.45E-02 -4.40E-02 -4.39E-02 -4.37E-02 -4.31E-02 -4.32E-02 -4.41E-02
-1.50E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
107
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @ +/- 15 V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.51. Plot of Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.51. Raw data for Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ +/- 15 V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
5.41E-02
5.49E-02
5.80E-02
5.38E-02
5.79E-02
5.70E-02
5.63E-02
5.73E-02
5.59E-02
5.75E-02
5.77E-02
5.79E-02
10
5.34E-02
5.42E-02
5.74E-02
5.32E-02
5.73E-02
5.66E-02
5.58E-02
5.67E-02
5.56E-02
5.70E-02
5.75E-02
5.78E-02
20
5.30E-02
5.38E-02
5.67E-02
5.27E-02
5.66E-02
5.60E-02
5.53E-02
5.62E-02
5.47E-02
5.65E-02
5.69E-02
5.72E-02
30
5.23E-02
5.31E-02
5.62E-02
5.21E-02
5.61E-02
5.55E-02
5.48E-02
5.57E-02
5.45E-02
5.60E-02
5.66E-02
5.68E-02
50
5.23E-02
5.31E-02
5.60E-02
5.20E-02
5.59E-02
5.54E-02
5.46E-02
5.55E-02
5.43E-02
5.59E-02
5.65E-02
5.68E-02
60
5.23E-02
5.31E-02
5.60E-02
5.20E-02
5.59E-02
5.54E-02
5.46E-02
5.55E-02
5.43E-02
5.58E-02
5.65E-02
5.67E-02
70
5.23E-02
5.32E-02
5.61E-02
5.20E-02
5.60E-02
5.55E-02
5.47E-02
5.56E-02
5.44E-02
5.59E-02
5.64E-02
5.67E-02
5.57E-02
2.05E-03
6.13E-02
5.01E-02
5.51E-02
2.09E-03
6.08E-02
4.94E-02
5.46E-02
1.95E-03
5.99E-02
4.92E-02
5.40E-02
2.02E-03
5.95E-02
4.84E-02
5.39E-02
1.98E-03
5.93E-02
4.84E-02
5.39E-02
1.96E-03
5.93E-02
4.85E-02
5.39E-02
2.00E-03
5.94E-02
4.84E-02
5.68E-02
5.63E-02
5.58E-02
5.53E-02
5.51E-02
5.51E-02
5.52E-02
6.75E-04
6.16E-04
7.14E-04
6.36E-04
6.60E-04
6.40E-04
6.46E-04
5.86E-02
5.80E-02
5.77E-02
5.70E-02
5.70E-02
5.69E-02
5.70E-02
5.49E-02
5.46E-02
5.38E-02
5.35E-02
5.33E-02
5.34E-02
5.34E-02
1.50E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
109
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @ +/- 15 V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.52. Plot of Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.52. Raw data for Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ +/- 15 V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
5.21E-02
5.24E-02
5.54E-02
5.18E-02
5.56E-02
5.50E-02
5.40E-02
5.52E-02
5.38E-02
5.50E-02
5.55E-02
5.57E-02
10
5.14E-02
5.18E-02
5.48E-02
5.12E-02
5.50E-02
5.46E-02
5.36E-02
5.47E-02
5.34E-02
5.45E-02
5.53E-02
5.55E-02
20
5.10E-02
5.14E-02
5.42E-02
5.08E-02
5.43E-02
5.40E-02
5.31E-02
5.42E-02
5.27E-02
5.40E-02
5.47E-02
5.50E-02
30
5.04E-02
5.07E-02
5.36E-02
5.02E-02
5.38E-02
5.36E-02
5.27E-02
5.38E-02
5.24E-02
5.35E-02
5.44E-02
5.46E-02
50
5.03E-02
5.08E-02
5.35E-02
5.00E-02
5.37E-02
5.34E-02
5.25E-02
5.35E-02
5.22E-02
5.34E-02
5.44E-02
5.47E-02
60
5.04E-02
5.08E-02
5.35E-02
5.00E-02
5.37E-02
5.35E-02
5.25E-02
5.35E-02
5.22E-02
5.33E-02
5.43E-02
5.45E-02
70
5.03E-02
5.08E-02
5.36E-02
5.01E-02
5.37E-02
5.35E-02
5.25E-02
5.37E-02
5.23E-02
5.34E-02
5.43E-02
5.45E-02
5.34E-02
1.87E-03
5.86E-02
4.83E-02
5.28E-02
1.87E-03
5.80E-02
4.77E-02
5.24E-02
1.78E-03
5.72E-02
4.75E-02
5.17E-02
1.81E-03
5.67E-02
4.68E-02
5.16E-02
1.79E-03
5.66E-02
4.67E-02
5.17E-02
1.78E-03
5.65E-02
4.68E-02
5.17E-02
1.80E-03
5.66E-02
4.68E-02
5.46E-02
5.42E-02
5.36E-02
5.32E-02
5.30E-02
5.30E-02
5.31E-02
6.42E-04
6.12E-04
6.78E-04
6.04E-04
6.10E-04
6.17E-04
6.33E-04
5.64E-02
5.58E-02
5.55E-02
5.48E-02
5.47E-02
5.47E-02
5.48E-02
5.28E-02
5.25E-02
5.17E-02
5.15E-02
5.13E-02
5.13E-02
5.14E-02
1.50E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
111
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
4.50E-03
Positive Supply Current @ 5V (A)
4.40E-03
4.30E-03
4.20E-03
4.10E-03
4.00E-03
3.90E-03
3.80E-03
3.70E-03
3.60E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.53. Plot of Positive Supply Current @ 5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.53. Raw data for Positive Supply Current @ 5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @ 5V (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.85E-03
3.66E-03
3.75E-03
3.79E-03
3.90E-03
3.74E-03
3.70E-03
3.81E-03
3.76E-03
3.75E-03
3.75E-03
3.71E-03
10
3.83E-03
3.64E-03
3.73E-03
3.77E-03
3.87E-03
3.73E-03
3.69E-03
3.81E-03
3.75E-03
3.74E-03
3.76E-03
3.72E-03
20
3.82E-03
3.63E-03
3.72E-03
3.76E-03
3.85E-03
3.73E-03
3.69E-03
3.80E-03
3.75E-03
3.74E-03
3.76E-03
3.73E-03
30
3.82E-03
3.63E-03
3.73E-03
3.76E-03
3.86E-03
3.75E-03
3.70E-03
3.81E-03
3.76E-03
3.75E-03
3.78E-03
3.75E-03
50
3.78E-03
3.59E-03
3.70E-03
3.73E-03
3.82E-03
3.73E-03
3.69E-03
3.79E-03
3.75E-03
3.72E-03
3.77E-03
3.74E-03
60
3.79E-03
3.60E-03
3.70E-03
3.74E-03
3.82E-03
3.73E-03
3.69E-03
3.79E-03
3.76E-03
3.72E-03
3.77E-03
3.74E-03
70
3.80E-03
3.61E-03
3.71E-03
3.75E-03
3.83E-03
3.73E-03
3.70E-03
3.81E-03
3.75E-03
3.74E-03
3.78E-03
3.74E-03
3.79E-03
9.25E-05
4.04E-03
3.54E-03
3.77E-03
8.96E-05
4.01E-03
3.52E-03
3.76E-03
8.68E-05
3.99E-03
3.52E-03
3.76E-03
8.86E-05
4.00E-03
3.52E-03
3.72E-03
8.79E-05
3.97E-03
3.48E-03
3.73E-03
8.60E-05
3.97E-03
3.49E-03
3.74E-03
8.60E-05
3.98E-03
3.50E-03
3.75E-03
3.74E-03
3.74E-03
3.75E-03
3.74E-03
3.74E-03
3.75E-03
3.96E-05
4.34E-05
3.96E-05
3.91E-05
3.71E-05
3.83E-05
4.04E-05
3.86E-03
3.86E-03
3.85E-03
3.86E-03
3.84E-03
3.84E-03
3.86E-03
3.64E-03
3.63E-03
3.63E-03
3.65E-03
3.63E-03
3.63E-03
3.64E-03
4.40E-03
4.40E-03
4.40E-03
4.40E-03
4.40E-03
4.40E-03
4.40E-03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
113
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
-3.60E-03
Negative Supply Current @ 5V (A)
-3.70E-03
-3.80E-03
-3.90E-03
-4.00E-03
-4.10E-03
-4.20E-03
-4.30E-03
-4.40E-03
-4.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.54. Plot of Negative Supply Current @ 5V (A) versus total dose. The solid diamonds are the average
of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.54. Raw data for Negative Supply Current @ 5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @ 5V (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
-3.84E-03
-3.65E-03
-3.74E-03
-3.79E-03
-3.89E-03
-3.73E-03
-3.69E-03
-3.81E-03
-3.75E-03
-3.74E-03
-3.74E-03
-3.71E-03
10
-3.82E-03
-3.63E-03
-3.72E-03
-3.76E-03
-3.86E-03
-3.73E-03
-3.68E-03
-3.80E-03
-3.74E-03
-3.74E-03
-3.75E-03
-3.72E-03
20
-3.81E-03
-3.62E-03
-3.71E-03
-3.75E-03
-3.85E-03
-3.72E-03
-3.68E-03
-3.80E-03
-3.74E-03
-3.73E-03
-3.76E-03
-3.72E-03
30
-3.81E-03
-3.62E-03
-3.72E-03
-3.75E-03
-3.85E-03
-3.74E-03
-3.70E-03
-3.80E-03
-3.75E-03
-3.74E-03
-3.77E-03
-3.74E-03
50
-3.77E-03
-3.58E-03
-3.69E-03
-3.72E-03
-3.81E-03
-3.72E-03
-3.68E-03
-3.78E-03
-3.75E-03
-3.71E-03
-3.77E-03
-3.73E-03
60
-3.78E-03
-3.59E-03
-3.69E-03
-3.72E-03
-3.82E-03
-3.72E-03
-3.68E-03
-3.78E-03
-3.74E-03
-3.72E-03
-3.77E-03
-3.73E-03
70
-3.79E-03
-3.60E-03
-3.70E-03
-3.74E-03
-3.82E-03
-3.72E-03
-3.69E-03
-3.80E-03
-3.74E-03
-3.73E-03
-3.77E-03
-3.74E-03
-3.78E-03
9.26E-05
-3.53E-03
-4.04E-03
-3.76E-03
8.96E-05
-3.51E-03
-4.00E-03
-3.75E-03
8.96E-05
-3.50E-03
-3.99E-03
-3.75E-03
8.86E-05
-3.51E-03
-3.99E-03
-3.71E-03
8.79E-05
-3.47E-03
-3.96E-03
-3.72E-03
8.86E-05
-3.48E-03
-3.96E-03
-3.73E-03
8.60E-05
-3.49E-03
-3.97E-03
-3.74E-03 -3.74E-03 -3.73E-03 -3.75E-03 -3.73E-03 -3.73E-03 -3.74E-03
4.34E-05
4.27E-05
4.34E-05
3.58E-05
3.83E-05
3.63E-05
4.04E-05
-3.63E-03 -3.62E-03 -3.62E-03 -3.65E-03 -3.62E-03 -3.63E-03 -3.63E-03
-3.86E-03 -3.85E-03 -3.85E-03 -3.84E-03 -3.83E-03 -3.83E-03 -3.85E-03
-4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
115
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 5V, VCM=0V #1 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.55. Plot of Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.55. Raw data for Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=0V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.56E-04
2.51E-04
1.20E-04
9.15E-05
-1.29E-04
-2.11E-05
3.42E-05
1.26E-04
-1.33E-04
2.23E-04
-5.86E-05
-3.13E-04
10
1.38E-04
2.16E-04
9.91E-05
6.02E-05
-1.57E-04
-2.96E-05
1.81E-05
1.06E-04
-1.46E-04
2.14E-04
-5.99E-05
-3.12E-04
20
1.50E-04
2.27E-04
1.06E-04
6.86E-05
-1.47E-04
-2.75E-05
1.63E-05
1.10E-04
-1.44E-04
2.21E-04
-5.89E-05
-3.11E-04
30
1.56E-04
2.31E-04
1.22E-04
7.32E-05
-1.40E-04
-2.05E-05
1.61E-05
1.15E-04
-1.43E-04
2.26E-04
-5.49E-05
-3.11E-04
50
1.54E-04
2.30E-04
1.26E-04
7.24E-05
-1.52E-04
-2.36E-05
1.56E-05
1.09E-04
-1.44E-04
2.29E-04
-5.54E-05
-3.14E-04
60
1.55E-04
2.31E-04
1.25E-04
7.35E-05
-1.51E-04
-2.45E-05
1.64E-05
1.09E-04
-1.45E-04
2.30E-04
-5.69E-05
-3.14E-04
70
1.81E-04
2.11E-04
9.84E-05
6.39E-05
-1.45E-04
-1.80E-05
2.00E-05
8.57E-05
-1.56E-04
1.98E-04
-5.64E-05
-3.14E-04
9.80E-05
1.40E-04
4.83E-04
-2.87E-04
7.13E-05
1.40E-04
4.55E-04
-3.12E-04
8.10E-05
1.40E-04
4.66E-04
-3.04E-04
8.86E-05
1.40E-04
4.73E-04
-2.96E-04
8.59E-05
1.45E-04
4.83E-04
-3.12E-04
8.68E-05
1.45E-04
4.84E-04
-3.10E-04
8.17E-05
1.40E-04
4.66E-04
-3.03E-04
4.58E-05
3.25E-05
3.51E-05
3.87E-05
3.73E-05
3.70E-05
2.59E-05
1.37E-04
1.36E-04
1.38E-04
1.40E-04
1.40E-04
1.41E-04
1.31E-04
4.20E-04
4.06E-04
4.14E-04
4.22E-04
4.22E-04
4.24E-04
3.85E-04
-3.29E-04 -3.41E-04 -3.44E-04 -3.45E-04 -3.48E-04 -3.50E-04 -3.33E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
117
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 5V, VCM=0V #2 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.56. Plot of Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.56. Raw data for Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=0V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.58E-04
-2.38E-04
1.91E-04
-5.01E-05
-2.61E-04
7.75E-05
1.05E-04
-2.07E-04
-1.41E-04
1.98E-04
1.32E-06
2.59E-04
10
1.34E-04
-2.56E-04
1.49E-04
-7.93E-05
-2.79E-04
6.81E-05
9.07E-05
-2.05E-04
-1.55E-04
1.88E-04
7.20E-07
2.72E-04
20
1.41E-04
-2.49E-04
1.53E-04
-7.11E-05
-2.56E-04
6.92E-05
9.22E-05
-1.74E-04
-1.54E-04
1.92E-04
1.92E-06
2.72E-04
30
1.44E-04
-2.47E-04
1.56E-04
-6.75E-05
-2.59E-04
7.07E-05
9.63E-05
-1.46E-04
-1.51E-04
1.96E-04
2.53E-06
2.65E-04
50
1.41E-04
-2.44E-04
1.49E-04
-6.41E-05
-2.56E-04
7.23E-05
9.18E-05
-9.67E-05
-1.57E-04
1.97E-04
1.68E-06
2.64E-04
60
1.43E-04
-2.43E-04
1.52E-04
-6.39E-05
-2.57E-04
7.39E-05
9.04E-05
-1.03E-04
-1.56E-04
1.96E-04
1.93E-06
2.64E-04
70
1.29E-04
-2.61E-04
1.17E-04
-5.00E-05
-2.71E-04
4.85E-05
8.48E-05
-2.03E-04
-1.55E-04
1.59E-04
1.92E-06
2.65E-04
-4.02E-05
2.12E-04
5.42E-04
-6.23E-04
-6.63E-05
2.05E-04
4.95E-04
-6.28E-04
-5.65E-05
2.00E-04
4.92E-04
-6.05E-04
-5.48E-05
2.02E-04
4.99E-04
-6.08E-04
-5.47E-05
1.98E-04
4.87E-04
-5.97E-04
-5.38E-05
1.99E-04
4.92E-04
-5.99E-04
-6.71E-05
1.95E-04
4.67E-04
-6.02E-04
6.49E-06 -2.80E-06
4.99E-06
1.31E-05
2.14E-05
2.03E-05 -1.30E-05
1.72E-04
1.69E-04
1.61E-04
1.55E-04
1.45E-04
1.46E-04
1.58E-04
4.79E-04
4.61E-04
4.47E-04
4.38E-04
4.19E-04
4.20E-04
4.19E-04
-4.66E-04 -4.66E-04 -4.37E-04 -4.11E-04 -3.76E-04 -3.79E-04 -4.45E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
119
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 5V, VCM=0V #1 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.57. Plot of Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.57. Raw data for Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=0V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
6.94E-09
-2.98E-09
7.49E-09
-1.51E-09
8.60E-10
1.53E-08
-3.63E-10
2.07E-09
1.58E-09
3.10E-09
9.11E-10
-9.36E-09
10
7.24E-09
-3.61E-09
7.08E-09
-2.05E-09
8.03E-10
1.52E-08
-1.33E-09
2.68E-09
1.86E-09
2.78E-09
8.75E-10
-9.25E-09
20
7.20E-09
-3.20E-09
7.28E-09
-1.53E-09
2.31E-10
1.48E-08
-1.33E-09
2.71E-09
2.13E-09
2.98E-09
9.02E-10
-9.18E-09
30
6.94E-09
-3.27E-09
7.22E-09
-1.55E-09
1.16E-10
1.41E-08
-1.75E-09
3.20E-09
2.36E-09
2.72E-09
8.15E-10
-8.84E-09
50
6.76E-09
-3.10E-09
7.70E-09
-1.85E-09
1.20E-10
1.34E-08
-2.55E-09
3.56E-09
2.81E-09
3.60E-09
8.28E-10
-9.04E-09
60
6.89E-09
-3.06E-09
7.80E-09
-2.30E-09
3.78E-10
1.36E-08
-2.03E-09
4.03E-09
2.49E-09
3.28E-09
8.81E-10
-9.01E-09
70
7.14E-09
-3.48E-09
7.03E-09
-1.25E-09
9.27E-10
1.39E-08
-9.56E-10
2.40E-09
2.29E-09
3.33E-09
8.49E-10
-8.94E-09
2.16E-09
4.82E-09
1.54E-08
-1.10E-08
1.89E-09
5.06E-09
1.58E-08
-1.20E-08
2.00E-09
4.94E-09
1.55E-08
-1.15E-08
1.89E-09
4.88E-09
1.53E-08
-1.15E-08
1.93E-09
4.99E-09
1.56E-08
-1.17E-08
1.94E-09
5.11E-09
1.59E-08
-1.21E-08
2.07E-09
4.83E-09
1.53E-08
-1.12E-08
4.34E-09
4.23E-09
4.25E-09
4.13E-09
4.16E-09
4.27E-09
4.20E-09
6.27E-09
6.34E-09
6.13E-09
5.92E-09
5.77E-09
5.72E-09
5.68E-09
2.15E-08
2.16E-08
2.10E-08
2.04E-08
2.00E-08
1.99E-08
1.98E-08
-1.29E-08 -1.32E-08 -1.25E-08 -1.21E-08 -1.16E-08 -1.14E-08 -1.14E-08
-6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
121
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 5V, VCM=0V #2 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.58. Plot of Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.58. Raw data for Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=0V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.00E-12
4.88E-09
3.12E-10
3.38E-09
-1.15E-09
3.46E-09
-3.15E-09
5.01E-09
-9.44E-09
3.29E-09
-1.21E-10
7.39E-10
10
-7.00E-12
5.13E-09
8.00E-12
3.29E-09
-1.45E-09
3.31E-09
-3.65E-09
5.49E-09
-9.23E-09
4.37E-09
-1.36E-10
8.13E-10
20
-4.72E-10
5.31E-09
-2.61E-10
3.55E-09
-8.37E-10
3.89E-09
-3.53E-09
5.05E-09
-9.07E-09
5.25E-09
-8.70E-11
9.11E-10
30
2.03E-10
4.89E-09
-5.95E-10
3.39E-09
-1.29E-09
3.93E-09
-3.22E-09
4.50E-09
-8.53E-09
5.30E-09
-1.70E-10
7.21E-10
50
-1.24E-09
4.70E-09
-1.42E-09
3.83E-09
-1.45E-09
5.08E-09
-2.80E-09
5.47E-09
-8.14E-09
6.88E-09
-1.54E-10
7.51E-10
60
-1.07E-09
4.96E-09
-1.20E-09
3.65E-09
-1.30E-09
4.60E-09
-3.04E-09
5.18E-09
-8.50E-09
6.51E-09
-1.06E-10
7.67E-10
70
1.46E-10
5.09E-09
-5.77E-10
3.96E-09
-1.15E-09
3.97E-09
-2.62E-09
4.48E-09
-8.99E-09
5.24E-09
-1.36E-10
7.92E-10
1.49E-09
2.53E-09
8.43E-09
-5.46E-09
1.39E-09
2.72E-09
8.84E-09
-6.06E-09
1.46E-09
2.79E-09
9.11E-09
-6.20E-09
1.32E-09
2.68E-09
8.67E-09
-6.03E-09
8.81E-10
3.10E-09
9.39E-09
-7.63E-09
1.01E-09
3.05E-09
9.36E-09
-7.35E-09
1.49E-09
2.83E-09
9.26E-09
-6.27E-09
-1.64E-10
5.66E-11
3.18E-10
3.94E-10
1.30E-09
9.50E-10
4.16E-10
6.06E-09
6.30E-09
6.37E-09
6.04E-09
6.49E-09
6.47E-09
6.13E-09
1.64E-08
1.73E-08
1.78E-08
1.70E-08
1.91E-08
1.87E-08
1.72E-08
-1.68E-08 -1.72E-08 -1.72E-08 -1.62E-08 -1.65E-08 -1.68E-08 -1.64E-08
-6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
123
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=0V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.59. Plot of Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.59. Raw data for Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=0V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.30E-07
-3.06E-07
-3.44E-07
-3.54E-07
-3.50E-07
-3.09E-07
-3.32E-07
-3.47E-07
-3.23E-07
-3.35E-07
-3.06E-07
-3.29E-07
10
-3.35E-07
-3.11E-07
-3.49E-07
-3.61E-07
-3.54E-07
-3.23E-07
-3.47E-07
-3.59E-07
-3.35E-07
-3.52E-07
-3.05E-07
-3.27E-07
20
-3.38E-07
-3.14E-07
-3.53E-07
-3.63E-07
-3.61E-07
-3.31E-07
-3.56E-07
-3.69E-07
-3.46E-07
-3.62E-07
-3.04E-07
-3.27E-07
30
-3.39E-07
-3.14E-07
-3.53E-07
-3.66E-07
-3.61E-07
-3.35E-07
-3.60E-07
-3.73E-07
-3.50E-07
-3.68E-07
-3.02E-07
-3.24E-07
50
-3.50E-07
-3.21E-07
-3.59E-07
-3.74E-07
-3.68E-07
-3.53E-07
-3.76E-07
-3.89E-07
-3.64E-07
-3.83E-07
-3.03E-07
-3.25E-07
60
-3.48E-07
-3.21E-07
-3.57E-07
-3.73E-07
-3.67E-07
-3.50E-07
-3.72E-07
-3.89E-07
-3.62E-07
-3.83E-07
-3.03E-07
-3.25E-07
70
-3.40E-07
-3.16E-07
-3.52E-07
-3.66E-07
-3.60E-07
-3.27E-07
-3.50E-07
-3.62E-07
-3.39E-07
-3.57E-07
-3.02E-07
-3.24E-07
-3.37E-07
1.95E-08
-2.83E-07
-3.90E-07
-3.42E-07
1.95E-08
-2.88E-07
-3.95E-07
-3.46E-07
2.05E-08
-2.89E-07
-4.02E-07
-3.47E-07
2.07E-08
-2.90E-07
-4.04E-07
-3.55E-07
2.07E-08
-2.98E-07
-4.11E-07
-3.53E-07
2.07E-08
-2.96E-07
-4.10E-07
-3.47E-07
1.97E-08
-2.93E-07
-4.01E-07
-3.29E-07 -3.43E-07 -3.53E-07 -3.57E-07 -3.73E-07 -3.71E-07 -3.47E-07
1.41E-08
1.43E-08
1.48E-08
1.51E-08
1.46E-08
1.56E-08
1.40E-08
-2.90E-07 -3.04E-07 -3.12E-07 -3.16E-07 -3.33E-07 -3.29E-07 -3.09E-07
-3.68E-07 -3.82E-07 -3.93E-07 -3.99E-07 -4.13E-07 -4.14E-07 -3.85E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
125
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=0V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.60. Plot of Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.60. Raw data for Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=0V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.30E-07
-2.94E-07
-3.38E-07
-3.54E-07
-3.49E-07
-3.06E-07
-3.35E-07
-3.40E-07
-3.33E-07
-3.33E-07
-3.16E-07
-3.22E-07
10
-3.35E-07
-2.99E-07
-3.45E-07
-3.59E-07
-3.55E-07
-3.19E-07
-3.49E-07
-3.53E-07
-3.48E-07
-3.49E-07
-3.15E-07
-3.21E-07
20
-3.38E-07
-3.01E-07
-3.49E-07
-3.61E-07
-3.58E-07
-3.27E-07
-3.58E-07
-3.67E-07
-3.55E-07
-3.58E-07
-3.14E-07
-3.20E-07
30
-3.40E-07
-3.03E-07
-3.51E-07
-3.64E-07
-3.61E-07
-3.31E-07
-3.62E-07
-3.76E-07
-3.58E-07
-3.65E-07
-3.12E-07
-3.18E-07
50
-3.52E-07
-3.10E-07
-3.57E-07
-3.72E-07
-3.67E-07
-3.47E-07
-3.74E-07
-3.97E-07
-3.73E-07
-3.78E-07
-3.13E-07
-3.19E-07
60
-3.49E-07
-3.09E-07
-3.55E-07
-3.71E-07
-3.68E-07
-3.46E-07
-3.72E-07
-3.95E-07
-3.72E-07
-3.77E-07
-3.13E-07
-3.19E-07
70
-3.41E-07
-3.03E-07
-3.49E-07
-3.64E-07
-3.60E-07
-3.23E-07
-3.52E-07
-3.63E-07
-3.51E-07
-3.53E-07
-3.12E-07
-3.18E-07
-3.33E-07
2.39E-08
-2.67E-07
-3.98E-07
-3.39E-07
2.41E-08
-2.72E-07
-4.05E-07
-3.42E-07
2.43E-08
-2.75E-07
-4.08E-07
-3.44E-07
2.46E-08
-2.76E-07
-4.11E-07
-3.52E-07
2.48E-08
-2.84E-07
-4.20E-07
-3.50E-07
2.49E-08
-2.82E-07
-4.19E-07
-3.43E-07
2.42E-08
-2.77E-07
-4.10E-07
-3.29E-07 -3.44E-07 -3.53E-07 -3.58E-07 -3.74E-07 -3.72E-07 -3.48E-07
1.33E-08
1.38E-08
1.52E-08
1.68E-08
1.79E-08
1.74E-08
1.49E-08
-2.93E-07 -3.06E-07 -3.11E-07 -3.12E-07 -3.25E-07 -3.25E-07 -3.07E-07
-3.66E-07 -3.82E-07 -3.95E-07 -4.04E-07 -4.23E-07 -4.20E-07 -3.89E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
127
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=0V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.61. Plot of Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.61. Raw data for Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=0V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.37E-07
-3.03E-07
-3.52E-07
-3.55E-07
-3.51E-07
-3.25E-07
-3.32E-07
-3.50E-07
-3.25E-07
-3.38E-07
-3.07E-07
-3.20E-07
10
-3.44E-07
-3.08E-07
-3.56E-07
-3.60E-07
-3.56E-07
-3.38E-07
-3.45E-07
-3.62E-07
-3.37E-07
-3.55E-07
-3.06E-07
-3.19E-07
20
-3.48E-07
-3.10E-07
-3.59E-07
-3.63E-07
-3.60E-07
-3.50E-07
-3.54E-07
-3.71E-07
-3.47E-07
-3.66E-07
-3.05E-07
-3.18E-07
30
-3.49E-07
-3.11E-07
-3.61E-07
-3.64E-07
-3.61E-07
-3.52E-07
-3.59E-07
-3.78E-07
-3.52E-07
-3.71E-07
-3.03E-07
-3.15E-07
50
-3.58E-07
-3.18E-07
-3.67E-07
-3.73E-07
-3.68E-07
-3.64E-07
-3.72E-07
-3.93E-07
-3.65E-07
-3.88E-07
-3.04E-07
-3.16E-07
60
-3.55E-07
-3.18E-07
-3.66E-07
-3.70E-07
-3.67E-07
-3.65E-07
-3.70E-07
-3.92E-07
-3.64E-07
-3.85E-07
-3.04E-07
-3.17E-07
70
-3.50E-07
-3.12E-07
-3.60E-07
-3.66E-07
-3.61E-07
-3.44E-07
-3.50E-07
-3.66E-07
-3.41E-07
-3.60E-07
-3.03E-07
-3.16E-07
-3.40E-07
2.16E-08
-2.81E-07
-3.99E-07
-3.45E-07
2.16E-08
-2.86E-07
-4.04E-07
-3.48E-07
2.19E-08
-2.88E-07
-4.08E-07
-3.49E-07
2.21E-08
-2.89E-07
-4.10E-07
-3.57E-07
2.22E-08
-2.96E-07
-4.18E-07
-3.55E-07
2.19E-08
-2.95E-07
-4.15E-07
-3.50E-07
2.17E-08
-2.90E-07
-4.09E-07
-3.34E-07 -3.48E-07 -3.57E-07 -3.63E-07 -3.77E-07 -3.75E-07 -3.52E-07
1.05E-08
1.09E-08
1.05E-08
1.16E-08
1.32E-08
1.27E-08
1.06E-08
-3.05E-07 -3.18E-07 -3.29E-07 -3.31E-07 -3.40E-07 -3.41E-07 -3.23E-07
-3.63E-07 -3.77E-07 -3.86E-07 -3.94E-07 -4.13E-07 -4.10E-07 -3.81E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
129
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=0V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.62. Plot of Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.62. Raw data for Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=0V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-3.30E-07
-2.99E-07
-3.38E-07
-3.59E-07
-3.48E-07
-3.10E-07
-3.32E-07
-3.47E-07
-3.24E-07
-3.37E-07
-3.16E-07
-3.23E-07
10
-3.35E-07
-3.04E-07
-3.47E-07
-3.63E-07
-3.54E-07
-3.23E-07
-3.45E-07
-3.62E-07
-3.36E-07
-3.54E-07
-3.15E-07
-3.22E-07
20
-3.38E-07
-3.07E-07
-3.50E-07
-3.66E-07
-3.59E-07
-3.31E-07
-3.53E-07
-3.75E-07
-3.49E-07
-3.63E-07
-3.14E-07
-3.21E-07
30
-3.40E-07
-3.08E-07
-3.50E-07
-3.67E-07
-3.59E-07
-3.35E-07
-3.58E-07
-3.82E-07
-3.50E-07
-3.69E-07
-3.12E-07
-3.19E-07
50
-3.51E-07
-3.15E-07
-3.56E-07
-3.74E-07
-3.67E-07
-3.51E-07
-3.72E-07
-4.02E-07
-3.65E-07
-3.85E-07
-3.13E-07
-3.20E-07
60
-3.50E-07
-3.14E-07
-3.55E-07
-3.74E-07
-3.66E-07
-3.50E-07
-3.70E-07
-4.01E-07
-3.65E-07
-3.85E-07
-3.13E-07
-3.20E-07
70
-3.44E-07
-3.09E-07
-3.49E-07
-3.69E-07
-3.58E-07
-3.27E-07
-3.51E-07
-3.70E-07
-3.40E-07
-3.58E-07
-3.12E-07
-3.19E-07
-3.35E-07
2.28E-08
-2.72E-07
-3.97E-07
-3.41E-07
2.29E-08
-2.78E-07
-4.03E-07
-3.44E-07
2.32E-08
-2.80E-07
-4.07E-07
-3.45E-07
2.31E-08
-2.81E-07
-4.08E-07
-3.53E-07
2.29E-08
-2.90E-07
-4.15E-07
-3.52E-07
2.31E-08
-2.88E-07
-4.15E-07
-3.46E-07
2.28E-08
-2.83E-07
-4.08E-07
-3.30E-07 -3.44E-07 -3.54E-07 -3.59E-07 -3.75E-07 -3.74E-07 -3.49E-07
1.39E-08
1.54E-08
1.65E-08
1.80E-08
1.95E-08
1.93E-08
1.64E-08
-2.92E-07 -3.02E-07 -3.09E-07 -3.09E-07 -3.21E-07 -3.21E-07 -3.04E-07
-3.68E-07 -3.86E-07 -4.00E-07 -4.08E-07 -4.28E-07 -4.27E-07 -3.94E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
131
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 5V, VCM=5V #1 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.63. Plot of Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.63. Raw data for Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.68E-04
2.97E-04
1.87E-04
2.41E-04
-6.05E-06
1.13E-04
4.72E-05
3.64E-04
-9.89E-05
3.01E-04
-6.41E-06
-1.27E-04
10
2.52E-04
2.69E-04
1.64E-04
2.13E-04
-3.99E-05
1.05E-04
3.36E-05
3.47E-04
-1.13E-04
3.01E-04
-7.37E-06
-1.28E-04
20
2.60E-04
2.81E-04
1.67E-04
2.18E-04
-3.29E-05
1.07E-04
3.50E-05
3.51E-04
-1.11E-04
3.08E-04
-6.41E-06
-1.28E-04
30
2.67E-04
2.86E-04
1.74E-04
2.21E-04
-2.86E-05
1.15E-04
3.51E-05
3.57E-04
-1.11E-04
3.17E-04
-3.39E-06
-1.28E-04
50
2.66E-04
2.88E-04
1.77E-04
2.18E-04
-3.67E-05
1.13E-04
3.82E-05
3.52E-04
-1.09E-04
3.23E-04
-2.30E-06
-1.29E-04
60
2.67E-04
2.89E-04
1.78E-04
2.19E-04
-3.55E-05
1.13E-04
3.80E-05
3.54E-04
-1.10E-04
3.24E-04
-2.66E-06
-1.28E-04
70
2.78E-04
2.86E-04
1.35E-04
2.36E-04
-2.67E-05
1.18E-04
4.96E-05
3.32E-04
-1.19E-04
2.85E-04
-2.78E-06
-1.27E-04
1.97E-04
1.21E-04
5.28E-04
-1.33E-04
1.72E-04
1.25E-04
5.14E-04
-1.71E-04
1.79E-04
1.26E-04
5.24E-04
-1.67E-04
1.84E-04
1.26E-04
5.31E-04
-1.63E-04
1.82E-04
1.30E-04
5.38E-04
-1.73E-04
1.83E-04
1.30E-04
5.39E-04
-1.72E-04
1.82E-04
1.31E-04
5.41E-04
-1.78E-04
1.45E-04
1.35E-04
1.38E-04
1.42E-04
1.43E-04
1.44E-04
1.33E-04
1.89E-04
1.91E-04
1.92E-04
1.95E-04
1.95E-04
1.96E-04
1.83E-04
6.63E-04
6.58E-04
6.66E-04
6.78E-04
6.78E-04
6.80E-04
6.34E-04
-3.72E-04 -3.88E-04 -3.90E-04 -3.93E-04 -3.91E-04 -3.93E-04 -3.68E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
133
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 5V, VCM=5V #2 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.64. Plot of Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
134
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.64. Raw data for Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.41E-04
5.77E-05
3.76E-04
-1.15E-05
-5.42E-05
2.43E-04
2.39E-04
2.14E-05
7.33E-05
3.61E-04
3.25E-04
2.75E-04
10
2.21E-04
3.79E-05
3.43E-04
-4.23E-05
-7.18E-05
2.36E-04
2.28E-04
2.23E-05
6.00E-05
3.62E-04
3.25E-04
2.86E-04
20
2.28E-04
4.64E-05
3.49E-04
-3.68E-05
-5.70E-05
2.39E-04
2.29E-04
5.03E-05
6.23E-05
3.68E-04
3.27E-04
2.86E-04
30
2.30E-04
4.91E-05
3.52E-04
-3.61E-05
-5.64E-05
2.42E-04
2.33E-04
7.42E-05
6.51E-05
3.73E-04
3.29E-04
2.79E-04
50
2.31E-04
4.97E-05
3.49E-04
-3.25E-05
-5.54E-05
2.48E-04
2.32E-04
1.16E-04
6.41E-05
3.76E-04
3.28E-04
2.77E-04
60
2.32E-04
5.06E-05
3.51E-04
-3.31E-05
-5.65E-05
2.48E-04
2.33E-04
1.13E-04
6.37E-05
3.77E-04
3.28E-04
2.77E-04
70
2.34E-04
5.66E-05
3.10E-04
-3.42E-05
-4.00E-05
2.35E-04
2.46E-04
2.49E-05
6.51E-05
3.55E-04
3.29E-04
2.79E-04
1.22E-04
1.82E-04
6.20E-04
-3.76E-04
9.75E-05
1.78E-04
5.86E-04
-3.91E-04
1.06E-04
1.76E-04
5.89E-04
-3.78E-04
1.08E-04
1.77E-04
5.93E-04
-3.78E-04
1.08E-04
1.75E-04
5.89E-04
-3.73E-04
1.09E-04
1.77E-04
5.93E-04
-3.76E-04
1.05E-04
1.59E-04
5.42E-04
-3.31E-04
1.87E-04
1.82E-04
1.90E-04
1.97E-04
2.07E-04
2.07E-04
1.85E-04
1.38E-04
1.39E-04
1.34E-04
1.29E-04
1.22E-04
1.23E-04
1.37E-04
5.67E-04
5.64E-04
5.56E-04
5.52E-04
5.42E-04
5.44E-04
5.61E-04
-1.92E-04 -2.01E-04 -1.76E-04 -1.57E-04 -1.27E-04 -1.30E-04 -1.91E-04
-8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
8.00E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
9.50E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
135
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 5V, VCM=5V #1 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.65. Plot of Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
136
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.65. Raw data for Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=5V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
4.01E-09
9.28E-10
-2.98E-09
-4.78E-09
2.07E-09
1.43E-09
5.45E-09
-8.25E-09
-4.18E-09
1.37E-08
-2.75E-09
8.50E-09
10
5.84E-09
1.72E-09
-2.55E-09
-3.66E-09
9.29E-10
3.23E-10
5.55E-09
-6.94E-09
-4.73E-09
1.99E-08
-2.72E-09
8.18E-09
20
4.40E-09
1.81E-09
-4.17E-09
-4.56E-09
-5.77E-10
1.45E-10
6.70E-09
-6.22E-09
-4.30E-09
1.87E-08
-2.70E-09
8.23E-09
30
4.31E-09
1.14E-09
-4.85E-09
-4.95E-09
-9.75E-10
2.74E-10
7.33E-09
-7.29E-09
-4.17E-09
1.92E-08
-2.68E-09
8.21E-09
50
3.78E-09
-4.03E-10
-5.09E-09
-7.67E-09
-3.60E-09
-1.00E-11
6.49E-09
-9.21E-09
-3.40E-09
1.85E-08
-2.71E-09
8.10E-09
60
3.54E-09
-1.39E-10
-4.45E-09
-7.53E-09
-2.56E-09
2.26E-10
5.77E-09
-7.83E-09
-3.33E-09
1.83E-08
-2.76E-09
8.13E-09
70
1.63E-08
1.37E-08
9.59E-09
7.70E-09
1.67E-08
6.94E-10
5.79E-09
-9.87E-09
-3.37E-09
1.57E-08
-2.66E-09
8.09E-09
-1.51E-10
3.63E-09
9.81E-09
-1.01E-08
4.55E-10
3.77E-09
1.08E-08
-9.88E-09
-6.19E-10
3.85E-09
9.93E-09
-1.12E-08
-1.06E-09
3.97E-09
9.83E-09
-1.20E-08
-2.59E-09
4.42E-09
9.54E-09
-1.47E-08
-2.23E-09
4.21E-09
9.31E-09
-1.38E-08
1.28E-08
4.00E-09
2.38E-08
1.80E-09
1.64E-09
2.82E-09
3.00E-09
3.07E-09
2.47E-09
2.63E-09
1.79E-09
8.55E-09
1.07E-08
1.01E-08
1.06E-08
1.06E-08
1.01E-08
9.66E-09
2.51E-08
3.22E-08
3.06E-08
3.20E-08
3.15E-08
3.03E-08
2.83E-08
-2.18E-08 -2.65E-08 -2.46E-08 -2.59E-08 -2.66E-08 -2.50E-08 -2.47E-08
-6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
137
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 5V, VCM=5V #2 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.66. Plot of Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
138
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.66. Raw data for Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=5V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
9.86E-09
3.68E-09
1.22E-08
3.66E-09
-5.09E-09
7.48E-09
1.30E-08
-1.63E-09
1.02E-08
7.67E-10
2.08E-09
6.01E-10
10
1.05E-08
4.13E-09
1.25E-08
4.73E-09
-5.22E-09
8.18E-09
1.29E-08
1.07E-09
1.04E-08
3.87E-09
2.01E-09
6.72E-10
20
9.96E-09
3.91E-09
1.25E-08
4.35E-09
-7.21E-09
8.23E-09
1.29E-08
2.64E-09
1.01E-08
3.55E-09
2.10E-09
5.88E-10
30
9.03E-09
3.26E-09
1.23E-08
3.81E-09
-6.22E-09
8.81E-09
1.27E-08
4.34E-09
9.38E-09
2.48E-09
2.15E-09
6.02E-10
50
7.60E-09
1.49E-09
1.05E-08
3.69E-09
-8.20E-09
9.27E-09
1.32E-08
7.01E-09
9.59E-09
1.18E-09
2.05E-09
5.49E-10
60
8.10E-09
1.70E-09
1.02E-08
3.69E-09
-8.48E-09
9.01E-09
1.41E-08
6.81E-09
9.03E-09
1.50E-09
2.11E-09
5.52E-10
70
2.01E-08
1.68E-08
2.54E-08
1.52E-08
1.12E-08
7.68E-09
1.30E-08
5.27E-10
1.06E-08
2.61E-09
2.12E-09
4.96E-10
4.86E-09
6.71E-09
2.33E-08
-1.36E-08
5.33E-09
6.91E-09
2.43E-08
-1.36E-08
4.69E-09
7.59E-09
2.55E-08
-1.61E-08
4.44E-09
7.04E-09
2.37E-08
-1.49E-08
3.02E-09
7.18E-09
2.27E-08
-1.67E-08
3.03E-09
7.26E-09
2.29E-08
-1.69E-08
1.77E-08
5.34E-09
3.24E-08
3.11E-09
5.96E-09
7.28E-09
7.46E-09
7.55E-09
8.06E-09
8.08E-09
6.89E-09
6.21E-09
4.81E-09
4.33E-09
4.11E-09
4.45E-09
4.54E-09
5.26E-09
2.30E-08
2.05E-08
1.93E-08
1.88E-08
2.03E-08
2.05E-08
2.13E-08
-1.11E-08 -5.90E-09 -4.41E-09 -3.73E-09 -4.14E-09 -4.37E-09 -7.53E-09
-6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
6.50E-08
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
139
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=5V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.67. Plot of Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
140
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.67. Raw data for Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=5V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.44E-07
3.11E-07
3.43E-07
3.35E-07
3.41E-07
3.22E-07
3.43E-07
3.29E-07
3.21E-07
3.41E-07
3.16E-07
3.24E-07
10
3.67E-07
3.36E-07
3.68E-07
3.53E-07
3.67E-07
3.57E-07
3.77E-07
3.72E-07
3.53E-07
3.88E-07
3.15E-07
3.23E-07
20
3.81E-07
3.51E-07
3.85E-07
3.70E-07
3.88E-07
3.83E-07
4.01E-07
4.06E-07
3.77E-07
4.20E-07
3.15E-07
3.23E-07
30
3.93E-07
3.65E-07
3.94E-07
3.82E-07
4.02E-07
4.02E-07
4.18E-07
4.29E-07
3.93E-07
4.41E-07
3.13E-07
3.22E-07
50
4.18E-07
3.92E-07
4.23E-07
4.08E-07
4.32E-07
4.37E-07
4.51E-07
4.76E-07
4.26E-07
4.87E-07
3.14E-07
3.23E-07
60
4.19E-07
3.91E-07
4.22E-07
4.06E-07
4.30E-07
4.34E-07
4.47E-07
4.71E-07
4.23E-07
4.80E-07
3.14E-07
3.23E-07
70
4.03E-07
3.75E-07
4.04E-07
3.91E-07
4.12E-07
3.86E-07
4.05E-07
4.00E-07
3.80E-07
4.14E-07
3.14E-07
3.22E-07
3.35E-07
1.36E-08
3.72E-07
2.98E-07
3.58E-07
1.39E-08
3.96E-07
3.20E-07
3.75E-07
1.50E-08
4.16E-07
3.34E-07
3.87E-07
1.43E-08
4.27E-07
3.48E-07
4.14E-07
1.55E-08
4.57E-07
3.72E-07
4.14E-07
1.55E-08
4.56E-07
3.71E-07
3.97E-07
1.43E-08
4.36E-07
3.58E-07
3.31E-07
3.69E-07
3.97E-07
4.17E-07
4.56E-07
4.51E-07
3.97E-07
1.03E-08
1.47E-08
1.77E-08
1.94E-08
2.55E-08
2.44E-08
1.38E-08
3.60E-07
4.10E-07
4.46E-07
4.70E-07
5.26E-07
5.18E-07
4.35E-07
3.03E-07
3.29E-07
3.49E-07
3.63E-07
3.86E-07
3.84E-07
3.59E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
141
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=5V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.68. Plot of Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
142
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.68. Raw data for Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=5V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.43E-07
3.03E-07
3.41E-07
3.41E-07
3.39E-07
3.28E-07
3.40E-07
3.41E-07
3.33E-07
3.27E-07
3.18E-07
3.16E-07
10
3.65E-07
3.27E-07
3.66E-07
3.65E-07
3.63E-07
3.64E-07
3.71E-07
3.93E-07
3.64E-07
3.71E-07
3.17E-07
3.15E-07
20
3.78E-07
3.42E-07
3.83E-07
3.82E-07
3.83E-07
3.89E-07
3.95E-07
4.38E-07
3.88E-07
4.02E-07
3.17E-07
3.15E-07
30
3.90E-07
3.55E-07
3.96E-07
3.92E-07
3.97E-07
4.09E-07
4.11E-07
4.69E-07
4.04E-07
4.22E-07
3.16E-07
3.13E-07
50
4.15E-07
3.83E-07
4.21E-07
4.20E-07
4.31E-07
4.45E-07
4.47E-07
5.37E-07
4.39E-07
4.64E-07
3.16E-07
3.15E-07
60
4.16E-07
3.82E-07
4.18E-07
4.18E-07
4.29E-07
4.40E-07
4.43E-07
5.28E-07
4.34E-07
4.58E-07
3.16E-07
3.14E-07
70
4.00E-07
3.68E-07
4.02E-07
4.01E-07
4.09E-07
3.90E-07
3.98E-07
4.31E-07
3.91E-07
3.97E-07
3.16E-07
3.14E-07
3.33E-07
1.72E-08
3.80E-07
2.86E-07
3.57E-07
1.71E-08
4.04E-07
3.10E-07
3.74E-07
1.78E-08
4.22E-07
3.25E-07
3.86E-07
1.78E-08
4.35E-07
3.37E-07
4.14E-07
1.81E-08
4.64E-07
3.64E-07
4.12E-07
1.78E-08
4.61E-07
3.64E-07
3.96E-07
1.63E-08
4.41E-07
3.51E-07
3.34E-07
3.73E-07
4.03E-07
4.23E-07
4.66E-07
4.61E-07
4.02E-07
6.43E-09
1.20E-08
2.04E-08
2.67E-08
4.07E-08
3.87E-08
1.71E-08
3.51E-07
4.06E-07
4.58E-07
4.96E-07
5.78E-07
5.67E-07
4.48E-07
3.16E-07
3.40E-07
3.47E-07
3.50E-07
3.55E-07
3.54E-07
3.55E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
143
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=5V #1 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.69. Plot of Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
144
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.69. Raw data for Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=5V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.39E-07
3.10E-07
3.46E-07
3.39E-07
3.39E-07
3.21E-07
3.41E-07
3.38E-07
3.25E-07
3.27E-07
3.18E-07
3.16E-07
10
3.59E-07
3.34E-07
3.70E-07
3.57E-07
3.66E-07
3.56E-07
3.71E-07
3.79E-07
3.55E-07
3.68E-07
3.18E-07
3.15E-07
20
3.76E-07
3.49E-07
3.89E-07
3.74E-07
3.88E-07
3.84E-07
3.95E-07
4.13E-07
3.81E-07
4.01E-07
3.17E-07
3.15E-07
30
3.89E-07
3.63E-07
3.99E-07
3.85E-07
4.03E-07
4.01E-07
4.09E-07
4.38E-07
3.96E-07
4.21E-07
3.16E-07
3.14E-07
50
4.15E-07
3.93E-07
4.26E-07
4.15E-07
4.36E-07
4.37E-07
4.46E-07
4.86E-07
4.29E-07
4.67E-07
3.17E-07
3.15E-07
60
4.15E-07
3.91E-07
4.25E-07
4.15E-07
4.34E-07
4.33E-07
4.42E-07
4.80E-07
4.26E-07
4.61E-07
3.17E-07
3.14E-07
70
3.87E-07
3.61E-07
3.94E-07
3.83E-07
3.95E-07
3.85E-07
3.98E-07
4.09E-07
3.83E-07
3.97E-07
3.17E-07
3.14E-07
3.35E-07
1.41E-08
3.73E-07
2.96E-07
3.57E-07
1.40E-08
3.96E-07
3.19E-07
3.75E-07
1.59E-08
4.19E-07
3.32E-07
3.88E-07
1.56E-08
4.31E-07
3.45E-07
4.17E-07
1.60E-08
4.61E-07
3.73E-07
4.16E-07
1.59E-08
4.60E-07
3.72E-07
3.84E-07
1.39E-08
4.22E-07
3.46E-07
3.30E-07
3.66E-07
3.95E-07
4.13E-07
4.53E-07
4.48E-07
3.94E-07
8.44E-09
1.02E-08
1.32E-08
1.69E-08
2.33E-08
2.19E-08
1.08E-08
3.53E-07
3.94E-07
4.31E-07
4.59E-07
5.17E-07
5.08E-07
4.24E-07
3.07E-07
3.38E-07
3.58E-07
3.67E-07
3.89E-07
3.88E-07
3.65E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
145
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=5V #2 (A)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.70. Plot of Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
146
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.70. Raw data for Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=5V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.36E-07
2.99E-07
3.31E-07
3.41E-07
3.41E-07
3.21E-07
3.27E-07
3.40E-07
3.23E-07
3.26E-07
3.16E-07
3.15E-07
10
3.53E-07
3.22E-07
3.52E-07
3.58E-07
3.69E-07
3.56E-07
3.58E-07
3.89E-07
3.53E-07
3.67E-07
3.16E-07
3.14E-07
20
3.68E-07
3.38E-07
3.71E-07
3.77E-07
3.89E-07
3.81E-07
3.82E-07
4.33E-07
3.79E-07
4.00E-07
3.15E-07
3.14E-07
30
3.81E-07
3.52E-07
3.85E-07
3.88E-07
4.05E-07
4.01E-07
3.98E-07
4.63E-07
3.94E-07
4.20E-07
3.13E-07
3.13E-07
50
4.08E-07
3.81E-07
4.11E-07
4.16E-07
4.38E-07
4.36E-07
4.34E-07
5.30E-07
4.30E-07
4.64E-07
3.14E-07
3.14E-07
60
4.06E-07
3.79E-07
4.09E-07
4.15E-07
4.36E-07
4.31E-07
4.28E-07
5.23E-07
4.24E-07
4.58E-07
3.14E-07
3.13E-07
70
3.81E-07
3.49E-07
3.76E-07
3.86E-07
3.98E-07
3.84E-07
3.85E-07
4.30E-07
3.80E-07
3.97E-07
3.14E-07
3.13E-07
3.29E-07
1.76E-08
3.78E-07
2.81E-07
3.51E-07
1.73E-08
3.98E-07
3.03E-07
3.69E-07
1.87E-08
4.20E-07
3.17E-07
3.82E-07
1.93E-08
4.35E-07
3.29E-07
4.11E-07
2.06E-08
4.67E-07
3.54E-07
4.09E-07
2.02E-08
4.64E-07
3.54E-07
3.78E-07
1.81E-08
4.28E-07
3.28E-07
3.27E-07
3.64E-07
3.95E-07
4.15E-07
4.59E-07
4.53E-07
3.95E-07
7.40E-09
1.46E-08
2.30E-08
2.87E-08
4.18E-08
4.14E-08
2.06E-08
3.47E-07
4.04E-07
4.58E-07
4.94E-07
5.73E-07
5.66E-07
4.52E-07
3.07E-07
3.24E-07
3.32E-07
3.37E-07
3.44E-07
3.39E-07
3.39E-07
-6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
6.50E-07
7.00E-07
7.50E-07
7.50E-07
8.00E-07
8.00E-07
8.00E-07
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
147
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #1 (V/mV)
6.00E+03
4.00E+03
2.00E+03
0.00E+00
-2.00E+03
-4.00E+03
-6.00E+03
-8.00E+03
-1.00E+04
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.71. Plot of Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
148
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.71. Raw data for Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #1 (V/mV)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
2.64E+03
2.61E+03
2.53E+03
2.47E+03
3.45E+03
2.85E+03
2.52E+03
2.79E+03
2.34E+03
2.79E+03
2.21E+03
1.45E+03
10
2.60E+03
2.54E+03
2.54E+03
2.41E+03
1.79E+03
2.76E+03
2.40E+03
3.83E+03
1.84E+03
2.43E+03
2.16E+03
2.49E+03
20
2.27E+03
2.17E+03
2.54E+03
2.18E+03
1.67E+03
2.38E+03
2.63E+03
2.32E+03
2.44E+03
1.32E+04
2.25E+03
2.58E+03
30
2.41E+03
2.15E+03
2.29E+03
2.14E+03
2.56E+03
2.30E+03
2.89E+03
3.12E+03
2.22E+03
2.25E+03
2.40E+03
2.79E+03
50
2.23E+03
2.00E+03
2.57E+03
2.31E+03
2.19E+03
2.76E+03
2.81E+03
2.61E+03
1.68E+03
2.12E+03
1.54E+03
2.78E+03
60
2.44E+03
1.84E+03
2.58E+03
2.01E+03
2.48E+03
2.52E+03
1.85E+03
2.23E+03
3.94E+03
2.67E+03
2.29E+03
2.29E+03
70
2.33E+03
1.88E+03
2.30E+03
2.32E+03
2.52E+03
2.79E+03
2.54E+03
2.27E+03
1.86E+03
2.50E+03
2.55E+03
4.43E+03
2.74E+03
4.03E+02
3.85E+03
1.63E+03
2.38E+03
3.36E+02
3.30E+03
1.46E+03
2.17E+03
3.17E+02
3.04E+03
1.30E+03
2.31E+03
1.80E+02
2.80E+03
1.82E+03
2.26E+03
2.06E+02
2.82E+03
1.69E+03
2.27E+03
3.26E+02
3.16E+03
1.38E+03
2.27E+03
2.36E+02
2.92E+03
1.62E+03
2.66E+03 2.65E+03 4.60E+03 2.56E+03 2.40E+03 2.64E+03 2.39E+03
2.20E+02 7.36E+02 4.82E+03 4.20E+02 4.82E+02 7.90E+02 3.48E+02
3.26E+03 4.67E+03 1.78E+04 3.71E+03 3.72E+03 4.81E+03 3.35E+03
2.05E+03 6.32E+02 -8.61E+03 1.41E+03 1.08E+03 4.76E+02 1.44E+03
6.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
149
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #2 (V/mV)
3.50E+03
3.00E+03
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.72. Plot of Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.72. Raw data for Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #2 (V/mV)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
2.58E+03
2.35E+03
3.15E+03
2.41E+03
2.31E+03
2.68E+03
2.56E+03
2.07E+03
3.20E+03
2.29E+03
2.43E+03
2.22E+03
10
2.32E+03
1.85E+03
2.75E+03
2.52E+03
2.36E+03
3.04E+03
2.45E+03
3.32E+03
2.85E+03
2.73E+03
2.43E+03
2.66E+03
20
2.15E+03
2.33E+03
2.86E+03
2.59E+03
1.95E+03
1.98E+03
2.05E+03
2.21E+03
2.55E+03
2.62E+03
1.79E+03
2.35E+03
30
2.06E+03
1.91E+03
2.80E+03
1.91E+03
2.26E+03
2.06E+03
2.53E+03
2.30E+03
2.72E+03
2.06E+03
1.88E+03
1.49E+03
50
2.01E+03
1.90E+03
2.67E+03
2.14E+03
2.25E+03
1.77E+03
3.24E+03
2.22E+03
3.93E+03
1.95E+03
2.37E+03
2.41E+03
60
2.01E+03
1.91E+03
2.55E+03
2.25E+03
1.93E+03
2.34E+03
2.57E+03
2.08E+03
2.52E+03
2.13E+03
2.50E+03
2.59E+03
70
2.22E+03
1.98E+03
2.41E+03
2.29E+03
1.97E+03
2.00E+03
2.23E+03
2.02E+03
2.87E+03
2.31E+03
2.26E+03
2.40E+03
2.56E+03
3.46E+02
3.51E+03
1.61E+03
2.36E+03
3.31E+02
3.26E+03
1.45E+03
2.38E+03
3.59E+02
3.36E+03
1.39E+03
2.19E+03
3.73E+02
3.21E+03
1.16E+03
2.19E+03
2.96E+02
3.01E+03
1.38E+03
2.13E+03
2.71E+02
2.87E+03
1.39E+03
2.17E+03
1.94E+02
2.70E+03
1.64E+03
2.56E+03 2.88E+03 2.28E+03 2.33E+03 2.62E+03 2.33E+03 2.29E+03
4.29E+02 3.28E+02 2.91E+02 2.88E+02 9.28E+02 2.20E+02 3.55E+02
3.73E+03 3.78E+03 3.08E+03 3.13E+03 5.17E+03 2.93E+03 3.26E+03
1.38E+03 1.98E+03 1.48E+03 1.54E+03 7.80E+01 1.72E+03 1.31E+03
6.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
151
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio @ 5V #1 (dB)
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.73. Plot of Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
152
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.73. Raw data for Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 5V #1 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
9.30E+01
1.01E+02
9.73E+01
9.04E+01
9.22E+01
9.13E+01
1.12E+02
8.64E+01
1.03E+02
9.62E+01
9.95E+01
8.86E+01
10
9.29E+01
9.93E+01
9.76E+01
9.03E+01
9.27E+01
9.14E+01
1.11E+02
8.63E+01
1.03E+02
9.51E+01
9.94E+01
8.86E+01
20
9.31E+01
9.93E+01
9.82E+01
9.05E+01
9.29E+01
9.14E+01
1.09E+02
8.62E+01
1.04E+02
9.52E+01
9.95E+01
8.87E+01
30
9.31E+01
9.92E+01
9.95E+01
9.05E+01
9.31E+01
9.13E+01
1.08E+02
8.63E+01
1.03E+02
9.49E+01
9.96E+01
8.87E+01
50
9.30E+01
9.88E+01
9.94E+01
9.08E+01
9.27E+01
9.12E+01
1.07E+02
8.62E+01
1.03E+02
9.44E+01
9.94E+01
8.86E+01
60
9.30E+01
9.89E+01
9.94E+01
9.07E+01
9.28E+01
9.12E+01
1.07E+02
8.62E+01
1.03E+02
9.45E+01
9.93E+01
8.85E+01
70
9.42E+01
9.65E+01
1.03E+02
8.93E+01
9.25E+01
9.12E+01
1.05E+02
8.61E+01
1.03E+02
9.52E+01
9.93E+01
8.86E+01
9.47E+01
4.24E+00
1.06E+02
8.31E+01
9.45E+01
3.74E+00
1.05E+02
8.43E+01
9.48E+01
3.78E+00
1.05E+02
8.44E+01
9.51E+01
4.05E+00
1.06E+02
8.40E+01
9.49E+01
3.89E+00
1.06E+02
8.43E+01
9.49E+01
3.92E+00
1.06E+02
8.42E+01
9.50E+01
4.95E+00
1.09E+02
8.14E+01
9.78E+01 9.74E+01 9.70E+01 9.68E+01 9.64E+01 9.64E+01 9.60E+01
1.01E+01 9.75E+00 9.05E+00 8.83E+00 8.48E+00 8.64E+00 7.75E+00
1.25E+02 1.24E+02 1.22E+02 1.21E+02 1.20E+02 1.20E+02 1.17E+02
7.02E+01 7.07E+01 7.22E+01 7.25E+01 7.31E+01 7.28E+01 7.47E+01
7.60E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
153
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio @ 5V #2 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
2.00E+01
1.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.74. Plot of Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.74. Raw data for Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 5V #2 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
9.55E+01
8.45E+01
8.86E+01
1.02E+02
8.76E+01
8.97E+01
9.15E+01
8.67E+01
8.74E+01
8.97E+01
8.38E+01
1.10E+02
10
9.52E+01
8.46E+01
8.82E+01
1.03E+02
8.76E+01
8.95E+01
9.13E+01
8.68E+01
8.74E+01
8.91E+01
8.37E+01
1.11E+02
20
9.52E+01
8.45E+01
8.82E+01
1.03E+02
8.79E+01
8.94E+01
9.12E+01
8.70E+01
8.73E+01
8.90E+01
8.37E+01
1.12E+02
30
9.54E+01
8.45E+01
8.81E+01
1.04E+02
8.77E+01
8.93E+01
9.13E+01
8.70E+01
8.73E+01
8.90E+01
8.37E+01
1.12E+02
50
9.50E+01
8.46E+01
8.79E+01
1.04E+02
8.79E+01
8.91E+01
9.10E+01
8.72E+01
8.71E+01
8.90E+01
8.37E+01
1.12E+02
60
9.50E+01
8.45E+01
8.80E+01
1.04E+02
8.79E+01
8.91E+01
9.10E+01
8.72E+01
8.72E+01
8.89E+01
8.37E+01
1.11E+02
70
9.35E+01
8.39E+01
8.83E+01
1.10E+02
8.67E+01
8.85E+01
8.98E+01
8.68E+01
8.71E+01
8.81E+01
8.37E+01
1.12E+02
9.17E+01
7.16E+00
1.11E+02
7.21E+01
9.17E+01
7.28E+00
1.12E+02
7.17E+01
9.18E+01
7.50E+00
1.12E+02
7.13E+01
9.19E+01
7.78E+00
1.13E+02
7.06E+01
9.19E+01
7.86E+00
1.13E+02
7.04E+01
9.19E+01
7.88E+00
1.14E+02
7.03E+01
9.25E+01
1.06E+01
1.21E+02
6.36E+01
8.90E+01 8.88E+01 8.88E+01 8.88E+01 8.87E+01 8.87E+01 8.81E+01
1.95E+00 1.81E+00 1.73E+00 1.73E+00 1.58E+00 1.56E+00 1.22E+00
9.43E+01 9.38E+01 9.35E+01 9.35E+01 9.30E+01 9.30E+01 9.14E+01
8.36E+01 8.39E+01 8.40E+01 8.40E+01 8.43E+01 8.44E+01 8.47E+01
7.60E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
155
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching @ 5V (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.75. Plot of Common Mode Rejection Ratio Matching @ 5V (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.75. Raw data for Common Mode Rejection Ratio Matching @ 5V (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching @ 5V (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.05E+02
8.60E+01
9.26E+01
9.30E+01
9.54E+01
1.05E+02
9.23E+01
1.17E+02
8.89E+01
9.52E+01
8.53E+01
8.93E+01
10
1.05E+02
8.63E+01
9.18E+01
9.27E+01
9.47E+01
1.04E+02
9.23E+01
1.12E+02
8.89E+01
9.52E+01
8.53E+01
8.93E+01
20
1.07E+02
8.63E+01
9.15E+01
9.27E+01
9.51E+01
1.03E+02
9.25E+01
1.08E+02
8.87E+01
9.49E+01
8.52E+01
8.93E+01
30
1.06E+02
8.63E+01
9.08E+01
9.26E+01
9.45E+01
1.03E+02
9.27E+01
1.08E+02
8.87E+01
9.52E+01
8.52E+01
8.93E+01
50
1.07E+02
8.64E+01
9.07E+01
9.28E+01
9.53E+01
1.02E+02
9.25E+01
1.05E+02
8.87E+01
9.55E+01
8.52E+01
8.92E+01
60
1.07E+02
8.64E+01
9.07E+01
9.27E+01
9.52E+01
1.02E+02
9.24E+01
1.05E+02
8.87E+01
9.53E+01
8.52E+01
8.92E+01
70
1.16E+02
8.62E+01
9.01E+01
9.01E+01
9.29E+01
1.00E+02
9.16E+01
1.09E+02
8.88E+01
9.33E+01
8.52E+01
8.92E+01
9.43E+01
6.79E+00
1.13E+02
7.57E+01
9.42E+01
7.00E+00
1.13E+02
7.50E+01
9.44E+01
7.50E+00
1.15E+02
7.39E+01
9.40E+01
7.18E+00
1.14E+02
7.43E+01
9.44E+01
7.69E+00
1.16E+02
7.33E+01
9.44E+01
7.76E+00
1.16E+02
7.32E+01
9.50E+01
1.18E+01
1.27E+02
6.27E+01
9.97E+01 9.84E+01 9.75E+01 9.75E+01 9.69E+01 9.68E+01 9.65E+01
1.14E+01 9.28E+00 7.97E+00 7.83E+00 6.94E+00 6.80E+00 8.10E+00
1.31E+02 1.24E+02 1.19E+02 1.19E+02 1.16E+02 1.15E+02 1.19E+02
6.85E+01 7.29E+01 7.57E+01 7.60E+01 7.79E+01 7.81E+01 7.43E+01
7.50E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
157
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ 4.5V-12V #1 (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.76. Plot of Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.76. Raw data for Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ 4.5V-12V #1 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.05E+02
1.21E+02
1.05E+02
1.08E+02
1.11E+02
1.05E+02
1.23E+02
1.08E+02
1.10E+02
1.09E+02
1.23E+02
1.13E+02
10
1.05E+02
1.22E+02
1.05E+02
1.08E+02
1.11E+02
1.05E+02
1.23E+02
1.08E+02
1.10E+02
1.09E+02
1.23E+02
1.13E+02
20
1.05E+02
1.22E+02
1.04E+02
1.08E+02
1.11E+02
1.05E+02
1.23E+02
1.08E+02
1.11E+02
1.09E+02
1.22E+02
1.13E+02
30
1.05E+02
1.22E+02
1.04E+02
1.08E+02
1.11E+02
1.05E+02
1.23E+02
1.08E+02
1.11E+02
1.09E+02
1.22E+02
1.12E+02
50
1.05E+02
1.22E+02
1.04E+02
1.08E+02
1.11E+02
1.05E+02
1.23E+02
1.08E+02
1.10E+02
1.09E+02
1.22E+02
1.12E+02
60
1.05E+02
1.22E+02
1.04E+02
1.08E+02
1.12E+02
1.05E+02
1.23E+02
1.08E+02
1.11E+02
1.09E+02
1.23E+02
1.13E+02
70
1.05E+02
1.22E+02
1.04E+02
1.08E+02
1.11E+02
1.05E+02
1.23E+02
1.08E+02
1.10E+02
1.09E+02
1.23E+02
1.12E+02
1.10E+02
6.75E+00
1.29E+02
9.15E+01
1.10E+02
6.98E+00
1.29E+02
9.10E+01
1.10E+02
7.16E+00
1.30E+02
9.06E+01
1.10E+02
7.07E+00
1.29E+02
9.07E+01
1.10E+02
7.23E+00
1.30E+02
9.05E+01
1.10E+02
7.30E+00
1.30E+02
9.03E+01
1.10E+02
7.20E+00
1.30E+02
9.05E+01
1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02
6.76E+00 7.18E+00 6.89E+00 6.93E+00 7.18E+00 6.95E+00 6.90E+00
1.30E+02 1.31E+02 1.30E+02 1.30E+02 1.31E+02 1.30E+02 1.30E+02
9.25E+01 9.14E+01 9.22E+01 9.20E+01 9.15E+01 9.20E+01 9.21E+01
8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
159
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ 4.5V-12V #2 (dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.77. Plot of Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.77. Raw data for Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ 4.5V-12V #2 (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.21E+02
1.12E+02
1.03E+02
1.06E+02
1.08E+02
1.16E+02
1.10E+02
1.29E+02
1.09E+02
1.07E+02
1.26E+02
1.10E+02
10
1.20E+02
1.12E+02
1.03E+02
1.06E+02
1.08E+02
1.17E+02
1.10E+02
1.28E+02
1.09E+02
1.07E+02
1.26E+02
1.09E+02
20
1.20E+02
1.12E+02
1.03E+02
1.06E+02
1.08E+02
1.17E+02
1.10E+02
1.29E+02
1.09E+02
1.07E+02
1.26E+02
1.09E+02
30
1.20E+02
1.12E+02
1.03E+02
1.06E+02
1.08E+02
1.17E+02
1.10E+02
1.27E+02
1.09E+02
1.07E+02
1.26E+02
1.09E+02
50
1.20E+02
1.12E+02
1.03E+02
1.06E+02
1.08E+02
1.18E+02
1.10E+02
1.34E+02
1.09E+02
1.07E+02
1.26E+02
1.09E+02
60
1.20E+02
1.12E+02
1.03E+02
1.06E+02
1.08E+02
1.17E+02
1.10E+02
1.27E+02
1.09E+02
1.07E+02
1.26E+02
1.09E+02
70
1.20E+02
1.11E+02
1.03E+02
1.06E+02
1.08E+02
1.17E+02
1.10E+02
1.27E+02
1.09E+02
1.07E+02
1.27E+02
1.09E+02
1.10E+02
6.89E+00
1.29E+02
9.11E+01
1.10E+02
6.64E+00
1.28E+02
9.15E+01
1.10E+02
6.63E+00
1.28E+02
9.15E+01
1.10E+02
6.58E+00
1.28E+02
9.16E+01
1.10E+02
6.70E+00
1.28E+02
9.14E+01
1.10E+02
6.71E+00
1.28E+02
9.13E+01
1.10E+02
6.63E+00
1.28E+02
9.15E+01
1.14E+02 1.14E+02 1.14E+02 1.14E+02 1.16E+02 1.14E+02 1.14E+02
9.07E+00 8.62E+00 8.84E+00 8.32E+00 1.12E+01 8.10E+00 8.32E+00
1.39E+02 1.38E+02 1.39E+02 1.37E+02 1.46E+02 1.36E+02 1.37E+02
8.95E+01 9.08E+01 9.01E+01 9.13E+01 8.49E+01 9.19E+01 9.13E+01
8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
161
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio Matching @ 4.5V-12V
(dB)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.78. Plot of Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
162
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.78. Raw data for Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio Matching @ 4.5V-12V (dB)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
1.04E+02
1.09E+02
1.19E+02
1.20E+02
1.19E+02
1.08E+02
1.12E+02
1.09E+02
1.04E+02
1.22E+02
1.18E+02
1.20E+02
10
1.04E+02
1.09E+02
1.19E+02
1.20E+02
1.17E+02
1.07E+02
1.12E+02
1.09E+02
1.04E+02
1.23E+02
1.18E+02
1.19E+02
20
1.04E+02
1.09E+02
1.19E+02
1.19E+02
1.17E+02
1.07E+02
1.12E+02
1.09E+02
1.03E+02
1.23E+02
1.18E+02
1.20E+02
30
1.04E+02
1.09E+02
1.19E+02
1.20E+02
1.18E+02
1.07E+02
1.12E+02
1.09E+02
1.04E+02
1.23E+02
1.18E+02
1.19E+02
50
1.04E+02
1.10E+02
1.19E+02
1.19E+02
1.17E+02
1.07E+02
1.12E+02
1.09E+02
1.04E+02
1.22E+02
1.18E+02
1.19E+02
60
1.04E+02
1.09E+02
1.19E+02
1.20E+02
1.17E+02
1.07E+02
1.12E+02
1.09E+02
1.04E+02
1.23E+02
1.18E+02
1.19E+02
70
1.04E+02
1.09E+02
1.20E+02
1.20E+02
1.17E+02
1.07E+02
1.12E+02
1.09E+02
1.04E+02
1.22E+02
1.18E+02
1.19E+02
1.14E+02
7.19E+00
1.34E+02
9.45E+01
1.14E+02
7.09E+00
1.33E+02
9.45E+01
1.14E+02
6.83E+00
1.32E+02
9.50E+01
1.14E+02
6.99E+00
1.33E+02
9.47E+01
1.14E+02
6.81E+00
1.33E+02
9.52E+01
1.14E+02
6.86E+00
1.33E+02
9.49E+01
1.14E+02
7.22E+00
1.34E+02
9.43E+01
1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02
7.12E+00 7.41E+00 7.46E+00 7.45E+00 7.13E+00 7.53E+00 7.15E+00
1.30E+02 1.31E+02 1.32E+02 1.31E+02 1.30E+02 1.32E+02 1.30E+02
9.14E+01 9.06E+01 9.06E+01 9.06E+01 9.11E+01 9.04E+01 9.13E+01
8.20E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
163
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 5V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.79. Plot of Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
164
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.79. Raw data for Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.59E-03
1.67E-03
1.67E-03
1.67E-03
1.70E-03
1.75E-03
1.67E-03
1.57E-03
1.64E-03
1.94E-03
1.69E-03
1.65E-03
10
1.84E-03
1.72E-03
1.86E-03
1.71E-03
1.84E-03
1.82E-03
1.84E-03
1.88E-03
1.81E-03
1.94E-03
1.76E-03
1.72E-03
20
1.95E-03
1.65E-03
1.82E-03
1.90E-03
1.93E-03
1.85E-03
1.88E-03
1.95E-03
1.88E-03
1.98E-03
1.82E-03
1.73E-03
30
2.00E-03
1.71E-03
1.85E-03
1.77E-03
1.95E-03
1.77E-03
1.93E-03
1.98E-03
1.88E-03
1.92E-03
1.66E-03
1.80E-03
50
1.97E-03
1.83E-03
1.90E-03
1.93E-03
2.08E-03
1.97E-03
1.98E-03
2.13E-03
1.86E-03
2.08E-03
1.76E-03
1.66E-03
60
2.13E-03
1.77E-03
1.94E-03
1.86E-03
1.97E-03
2.13E-03
1.97E-03
2.21E-03
1.84E-03
2.16E-03
1.82E-03
1.81E-03
70
2.00E-03
1.83E-03
1.85E-03
1.96E-03
1.95E-03
1.81E-03
1.88E-03
2.00E-03
1.88E-03
1.86E-03
1.88E-03
1.75E-03
1.66E-03
4.12E-05
1.77E-03
1.55E-03
1.79E-03
7.27E-05
1.99E-03
1.59E-03
1.85E-03
1.22E-04
2.19E-03
1.51E-03
1.86E-03
1.21E-04
2.19E-03
1.52E-03
1.94E-03
9.26E-05
2.20E-03
1.69E-03
1.93E-03
1.34E-04
2.30E-03
1.57E-03
1.92E-03
7.40E-05
2.12E-03
1.72E-03
1.71E-03
1.86E-03
1.91E-03
1.90E-03
2.00E-03
2.06E-03
1.89E-03
1.42E-04
5.31E-05
5.45E-05
7.89E-05
1.05E-04
1.53E-04
6.99E-05
2.10E-03
2.00E-03
2.06E-03
2.11E-03
2.29E-03
2.48E-03
2.08E-03
1.32E-03
1.71E-03
1.76E-03
1.68E-03
1.72E-03
1.64E-03
1.69E-03
1.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
165
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 5V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.80. Plot of Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
166
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.80. Raw data for Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.69E-03
1.72E-03
1.67E-03
1.75E-03
1.79E-03
1.87E-03
1.81E-03
1.67E-03
1.64E-03
1.81E-03
1.75E-03
1.74E-03
10
1.71E-03
1.72E-03
1.82E-03
1.74E-03
1.93E-03
1.94E-03
1.89E-03
1.82E-03
1.88E-03
1.98E-03
1.86E-03
1.81E-03
20
1.87E-03
1.68E-03
1.92E-03
1.85E-03
1.88E-03
1.93E-03
1.95E-03
2.05E-03
1.88E-03
1.97E-03
1.78E-03
1.75E-03
30
1.77E-03
1.77E-03
1.85E-03
1.80E-03
1.92E-03
1.88E-03
1.97E-03
2.09E-03
1.80E-03
2.02E-03
1.71E-03
1.78E-03
50
1.90E-03
1.85E-03
1.86E-03
1.90E-03
2.07E-03
1.98E-03
1.95E-03
2.10E-03
1.93E-03
2.05E-03
1.73E-03
1.81E-03
60
1.87E-03
1.81E-03
1.94E-03
2.04E-03
2.03E-03
2.06E-03
2.13E-03
2.21E-03
2.11E-03
2.23E-03
1.74E-03
1.86E-03
70
1.95E-03
1.75E-03
1.88E-03
1.88E-03
2.17E-03
1.98E-03
1.78E-03
1.95E-03
1.98E-03
2.02E-03
1.71E-03
1.76E-03
1.72E-03
4.77E-05
1.85E-03
1.59E-03
1.78E-03
9.24E-05
2.04E-03
1.53E-03
1.84E-03
9.30E-05
2.10E-03
1.58E-03
1.82E-03
6.38E-05
2.00E-03
1.65E-03
1.92E-03
8.91E-05
2.16E-03
1.67E-03
1.94E-03
9.98E-05
2.21E-03
1.66E-03
1.93E-03
1.54E-04
2.35E-03
1.50E-03
1.76E-03
1.90E-03
1.96E-03
1.95E-03
2.00E-03
2.15E-03
1.94E-03
9.95E-05
6.10E-05
6.23E-05
1.14E-04
7.12E-05
7.09E-05
9.39E-05
2.03E-03
2.07E-03
2.13E-03
2.27E-03
2.20E-03
2.34E-03
2.20E-03
1.49E-03
1.73E-03
1.79E-03
1.64E-03
1.81E-03
1.95E-03
1.68E-03
1.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
2.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
167
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 5V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.81. Plot of Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
168
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.81. Raw data for Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
6.23E-02
5.97E-02
6.18E-02
5.94E-02
6.42E-02
6.30E-02
6.19E-02
6.19E-02
5.99E-02
6.46E-02
6.26E-02
6.29E-02
10
6.39E-02
6.10E-02
6.30E-02
6.05E-02
6.58E-02
6.36E-02
6.25E-02
6.25E-02
6.06E-02
6.53E-02
6.28E-02
6.32E-02
20
6.46E-02
6.17E-02
6.39E-02
6.12E-02
6.66E-02
6.41E-02
6.31E-02
6.30E-02
6.10E-02
6.59E-02
6.25E-02
6.30E-02
30
6.51E-02
6.23E-02
6.43E-02
6.17E-02
6.70E-02
6.44E-02
6.35E-02
6.36E-02
6.14E-02
6.60E-02
6.30E-02
6.34E-02
50
6.55E-02
6.27E-02
6.46E-02
6.24E-02
6.77E-02
6.49E-02
6.36E-02
6.39E-02
6.14E-02
6.70E-02
6.30E-02
6.34E-02
60
6.57E-02
6.27E-02
6.48E-02
6.23E-02
6.80E-02
6.48E-02
6.38E-02
6.39E-02
6.15E-02
6.68E-02
6.30E-02
6.34E-02
70
6.53E-02
6.25E-02
6.45E-02
6.20E-02
6.75E-02
6.47E-02
6.33E-02
6.32E-02
6.12E-02
6.62E-02
6.30E-02
6.34E-02
6.15E-02
1.99E-03
6.69E-02
5.60E-02
6.29E-02
2.17E-03
6.88E-02
5.69E-02
6.36E-02
2.21E-03
6.97E-02
5.75E-02
6.41E-02
2.14E-03
7.00E-02
5.82E-02
6.46E-02
2.17E-03
7.05E-02
5.86E-02
6.47E-02
2.29E-03
7.10E-02
5.84E-02
6.43E-02
2.22E-03
7.04E-02
5.83E-02
6.23E-02
6.29E-02
6.34E-02
6.38E-02
6.42E-02
6.42E-02
6.37E-02
1.74E-03
1.70E-03
1.80E-03
1.68E-03
2.01E-03
1.88E-03
1.84E-03
6.70E-02
6.76E-02
6.84E-02
6.84E-02
6.97E-02
6.93E-02
6.87E-02
5.75E-02
5.82E-02
5.85E-02
5.92E-02
5.87E-02
5.90E-02
5.87E-02
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
169
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 5V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.82. Plot of Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
170
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.82. Raw data for Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
6.23E-02
5.85E-02
6.15E-02
5.91E-02
6.45E-02
6.33E-02
6.19E-02
6.14E-02
6.02E-02
6.39E-02
6.28E-02
6.26E-02
10
6.37E-02
5.98E-02
6.29E-02
6.03E-02
6.61E-02
6.39E-02
6.25E-02
6.23E-02
6.06E-02
6.44E-02
6.32E-02
6.28E-02
20
6.42E-02
6.05E-02
6.32E-02
6.08E-02
6.66E-02
6.44E-02
6.29E-02
6.28E-02
6.10E-02
6.52E-02
6.31E-02
6.28E-02
30
6.47E-02
6.10E-02
6.39E-02
6.14E-02
6.73E-02
6.49E-02
6.34E-02
6.32E-02
6.14E-02
6.56E-02
6.36E-02
6.32E-02
50
6.51E-02
6.15E-02
6.43E-02
6.19E-02
6.76E-02
6.51E-02
6.39E-02
6.38E-02
6.18E-02
6.62E-02
6.34E-02
6.30E-02
60
6.55E-02
6.17E-02
6.47E-02
6.20E-02
6.77E-02
6.53E-02
6.36E-02
6.35E-02
6.20E-02
6.60E-02
6.33E-02
6.29E-02
70
6.49E-02
6.12E-02
6.41E-02
6.16E-02
6.75E-02
6.45E-02
6.35E-02
6.29E-02
6.13E-02
6.58E-02
6.35E-02
6.31E-02
6.12E-02
2.42E-03
6.78E-02
5.45E-02
6.26E-02
2.56E-03
6.96E-02
5.55E-02
6.31E-02
2.53E-03
7.00E-02
5.61E-02
6.37E-02
2.58E-03
7.08E-02
5.66E-02
6.41E-02
2.49E-03
7.09E-02
5.72E-02
6.43E-02
2.53E-03
7.13E-02
5.74E-02
6.39E-02
2.59E-03
7.10E-02
5.68E-02
6.21E-02
6.28E-02
6.32E-02
6.37E-02
6.41E-02
6.41E-02
6.36E-02
1.47E-03
1.49E-03
1.63E-03
1.62E-03
1.64E-03
1.59E-03
1.68E-03
6.62E-02
6.68E-02
6.77E-02
6.81E-02
6.86E-02
6.84E-02
6.82E-02
5.81E-02
5.87E-02
5.88E-02
5.92E-02
5.97E-02
5.97E-02
5.90E-02
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
1.50E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
171
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 5V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.83. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
172
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.83. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.14E-01
1.11E-01
1.13E-01
1.10E-01
1.17E-01
1.15E-01
1.13E-01
1.14E-01
1.11E-01
1.17E-01
1.15E-01
1.16E-01
10
1.16E-01
1.12E-01
1.15E-01
1.11E-01
1.19E-01
1.17E-01
1.14E-01
1.14E-01
1.12E-01
1.19E-01
1.16E-01
1.16E-01
20
1.17E-01
1.13E-01
1.16E-01
1.13E-01
1.20E-01
1.17E-01
1.15E-01
1.15E-01
1.13E-01
1.19E-01
1.15E-01
1.16E-01
30
1.18E-01
1.14E-01
1.17E-01
1.13E-01
1.21E-01
1.18E-01
1.16E-01
1.16E-01
1.13E-01
1.21E-01
1.17E-01
1.17E-01
50
1.18E-01
1.15E-01
1.17E-01
1.14E-01
1.22E-01
1.18E-01
1.16E-01
1.16E-01
1.13E-01
1.21E-01
1.16E-01
1.17E-01
60
1.19E-01
1.15E-01
1.18E-01
1.14E-01
1.22E-01
1.18E-01
1.16E-01
1.17E-01
1.13E-01
1.21E-01
1.16E-01
1.16E-01
70
1.18E-01
1.15E-01
1.17E-01
1.14E-01
1.21E-01
1.18E-01
1.16E-01
1.16E-01
1.13E-01
1.20E-01
1.16E-01
1.16E-01
1.13E-01
2.94E-03
1.21E-01
1.05E-01
1.15E-01
2.96E-03
1.23E-01
1.07E-01
1.16E-01
3.06E-03
1.24E-01
1.07E-01
1.17E-01
3.13E-03
1.25E-01
1.08E-01
1.17E-01
3.06E-03
1.26E-01
1.09E-01
1.17E-01
3.36E-03
1.27E-01
1.08E-01
1.17E-01
3.01E-03
1.25E-01
1.09E-01
1.14E-01
1.15E-01
1.16E-01
1.17E-01
1.17E-01
1.17E-01
1.16E-01
2.29E-03
2.49E-03
2.32E-03
2.68E-03
2.69E-03
2.77E-03
2.28E-03
1.20E-01
1.22E-01
1.22E-01
1.24E-01
1.24E-01
1.25E-01
1.23E-01
1.08E-01
1.08E-01
1.09E-01
1.09E-01
1.10E-01
1.09E-01
1.10E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
173
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 5V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.84. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
174
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.84. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.14E-01
1.09E-01
1.13E-01
1.10E-01
1.18E-01
1.16E-01
1.13E-01
1.13E-01
1.11E-01
1.16E-01
1.15E-01
1.15E-01
10
1.16E-01
1.11E-01
1.15E-01
1.11E-01
1.19E-01
1.17E-01
1.14E-01
1.14E-01
1.12E-01
1.18E-01
1.16E-01
1.15E-01
20
1.17E-01
1.12E-01
1.16E-01
1.12E-01
1.20E-01
1.18E-01
1.15E-01
1.15E-01
1.13E-01
1.18E-01
1.16E-01
1.15E-01
30
1.18E-01
1.12E-01
1.17E-01
1.13E-01
1.21E-01
1.19E-01
1.16E-01
1.16E-01
1.13E-01
1.19E-01
1.16E-01
1.16E-01
50
1.18E-01
1.13E-01
1.17E-01
1.13E-01
1.22E-01
1.19E-01
1.16E-01
1.16E-01
1.13E-01
1.20E-01
1.16E-01
1.16E-01
60
1.18E-01
1.13E-01
1.17E-01
1.14E-01
1.22E-01
1.19E-01
1.16E-01
1.16E-01
1.14E-01
1.20E-01
1.17E-01
1.16E-01
70
1.18E-01
1.13E-01
1.17E-01
1.13E-01
1.21E-01
1.18E-01
1.16E-01
1.16E-01
1.13E-01
1.19E-01
1.16E-01
1.16E-01
1.13E-01
3.49E-03
1.22E-01
1.03E-01
1.14E-01
3.59E-03
1.24E-01
1.05E-01
1.15E-01
3.60E-03
1.25E-01
1.05E-01
1.16E-01
3.60E-03
1.26E-01
1.06E-01
1.16E-01
3.73E-03
1.27E-01
1.06E-01
1.17E-01
3.58E-03
1.27E-01
1.07E-01
1.16E-01
3.49E-03
1.26E-01
1.07E-01
1.14E-01
1.15E-01
1.16E-01
1.17E-01
1.17E-01
1.17E-01
1.16E-01
2.16E-03
2.26E-03
2.32E-03
2.26E-03
2.50E-03
2.33E-03
2.25E-03
1.20E-01
1.21E-01
1.22E-01
1.23E-01
1.24E-01
1.23E-01
1.23E-01
1.08E-01
1.09E-01
1.09E-01
1.10E-01
1.10E-01
1.11E-01
1.10E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
2.50E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
175
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 5V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.85. Plot of Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
176
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.85. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.47E-02
1.46E-02
1.40E-02
1.49E-02
1.41E-02
1.41E-02
1.47E-02
1.41E-02
1.45E-02
1.42E-02
1.43E-02
1.41E-02
10
1.50E-02
1.50E-02
1.44E-02
1.53E-02
1.46E-02
1.44E-02
1.49E-02
1.43E-02
1.48E-02
1.44E-02
1.42E-02
1.43E-02
20
1.50E-02
1.51E-02
1.45E-02
1.54E-02
1.46E-02
1.47E-02
1.50E-02
1.47E-02
1.49E-02
1.45E-02
1.45E-02
1.44E-02
30
1.52E-02
1.54E-02
1.48E-02
1.57E-02
1.50E-02
1.49E-02
1.54E-02
1.50E-02
1.51E-02
1.49E-02
1.45E-02
1.44E-02
50
1.52E-02
1.53E-02
1.49E-02
1.57E-02
1.49E-02
1.50E-02
1.56E-02
1.51E-02
1.55E-02
1.51E-02
1.45E-02
1.44E-02
60
1.54E-02
1.53E-02
1.48E-02
1.57E-02
1.49E-02
1.51E-02
1.57E-02
1.51E-02
1.53E-02
1.52E-02
1.45E-02
1.45E-02
70
1.52E-02
1.52E-02
1.47E-02
1.56E-02
1.47E-02
1.48E-02
1.53E-02
1.46E-02
1.50E-02
1.47E-02
1.45E-02
1.44E-02
1.44E-02
4.21E-04
1.56E-02
1.33E-02
1.49E-02
3.63E-04
1.59E-02
1.39E-02
1.49E-02
3.64E-04
1.59E-02
1.39E-02
1.52E-02
3.51E-04
1.62E-02
1.43E-02
1.52E-02
3.00E-04
1.60E-02
1.44E-02
1.52E-02
3.44E-04
1.62E-02
1.43E-02
1.51E-02
3.90E-04
1.62E-02
1.40E-02
1.43E-02
1.46E-02
1.48E-02
1.51E-02
1.53E-02
1.53E-02
1.49E-02
2.88E-04
2.90E-04
2.07E-04
2.02E-04
2.44E-04
2.36E-04
2.71E-04
1.51E-02
1.54E-02
1.53E-02
1.56E-02
1.59E-02
1.59E-02
1.56E-02
1.35E-02
1.38E-02
1.42E-02
1.45E-02
1.46E-02
1.46E-02
1.41E-02
3.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
177
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 5V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.86. Plot of Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
178
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.86. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
1.49E-02
1.51E-02
1.46E-02
1.53E-02
1.43E-02
1.44E-02
1.48E-02
1.44E-02
1.48E-02
1.46E-02
1.45E-02
1.42E-02
10
1.53E-02
1.54E-02
1.49E-02
1.55E-02
1.47E-02
1.46E-02
1.53E-02
1.48E-02
1.48E-02
1.49E-02
1.47E-02
1.43E-02
20
1.55E-02
1.56E-02
1.50E-02
1.58E-02
1.49E-02
1.48E-02
1.55E-02
1.50E-02
1.53E-02
1.51E-02
1.46E-02
1.44E-02
30
1.59E-02
1.57E-02
1.51E-02
1.59E-02
1.50E-02
1.51E-02
1.57E-02
1.53E-02
1.53E-02
1.52E-02
1.47E-02
1.44E-02
50
1.58E-02
1.56E-02
1.50E-02
1.60E-02
1.51E-02
1.53E-02
1.58E-02
1.55E-02
1.57E-02
1.57E-02
1.49E-02
1.44E-02
60
1.58E-02
1.58E-02
1.52E-02
1.59E-02
1.51E-02
1.52E-02
1.58E-02
1.55E-02
1.56E-02
1.56E-02
1.46E-02
1.45E-02
70
1.57E-02
1.57E-02
1.50E-02
1.60E-02
1.50E-02
1.49E-02
1.55E-02
1.50E-02
1.51E-02
1.52E-02
1.46E-02
1.43E-02
1.48E-02
4.13E-04
1.60E-02
1.37E-02
1.52E-02
3.61E-04
1.62E-02
1.42E-02
1.53E-02
3.71E-04
1.64E-02
1.43E-02
1.55E-02
4.25E-04
1.67E-02
1.44E-02
1.55E-02
4.02E-04
1.66E-02
1.44E-02
1.56E-02
3.86E-04
1.66E-02
1.45E-02
1.55E-02
4.57E-04
1.67E-02
1.42E-02
1.46E-02
1.49E-02
1.51E-02
1.53E-02
1.56E-02
1.55E-02
1.51E-02
1.89E-04
2.52E-04
2.70E-04
2.15E-04
1.88E-04
2.17E-04
2.36E-04
1.51E-02
1.55E-02
1.59E-02
1.59E-02
1.61E-02
1.61E-02
1.58E-02
1.41E-02
1.42E-02
1.44E-02
1.47E-02
1.51E-02
1.49E-02
1.45E-02
3.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
6.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
179
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 5V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.87. Plot of Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
180
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.87. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.38E-02
3.39E-02
3.24E-02
3.38E-02
3.30E-02
3.35E-02
3.37E-02
3.29E-02
3.34E-02
3.33E-02
3.35E-02
3.34E-02
10
3.43E-02
3.43E-02
3.32E-02
3.41E-02
3.32E-02
3.38E-02
3.41E-02
3.34E-02
3.36E-02
3.35E-02
3.35E-02
3.35E-02
20
3.45E-02
3.45E-02
3.32E-02
3.45E-02
3.35E-02
3.39E-02
3.41E-02
3.34E-02
3.39E-02
3.38E-02
3.34E-02
3.34E-02
30
3.47E-02
3.47E-02
3.36E-02
3.46E-02
3.38E-02
3.42E-02
3.45E-02
3.38E-02
3.42E-02
3.40E-02
3.38E-02
3.36E-02
50
3.46E-02
3.46E-02
3.36E-02
3.47E-02
3.41E-02
3.45E-02
3.45E-02
3.41E-02
3.42E-02
3.44E-02
3.36E-02
3.37E-02
60
3.50E-02
3.50E-02
3.36E-02
3.47E-02
3.41E-02
3.45E-02
3.45E-02
3.40E-02
3.42E-02
3.44E-02
3.36E-02
3.36E-02
70
3.48E-02
3.45E-02
3.34E-02
3.46E-02
3.38E-02
3.40E-02
3.43E-02
3.38E-02
3.40E-02
3.40E-02
3.37E-02
3.35E-02
3.33E-02
6.30E-04
3.51E-02
3.16E-02
3.38E-02
5.57E-04
3.53E-02
3.23E-02
3.40E-02
6.14E-04
3.57E-02
3.24E-02
3.43E-02
5.73E-04
3.58E-02
3.27E-02
3.43E-02
4.73E-04
3.56E-02
3.30E-02
3.45E-02
6.02E-04
3.61E-02
3.28E-02
3.42E-02
5.80E-04
3.58E-02
3.26E-02
3.34E-02
3.37E-02
3.38E-02
3.41E-02
3.43E-02
3.43E-02
3.40E-02
2.90E-04
2.85E-04
2.57E-04
2.61E-04
1.74E-04
2.24E-04
1.73E-04
3.42E-02
3.45E-02
3.45E-02
3.49E-02
3.48E-02
3.49E-02
3.45E-02
3.26E-02
3.29E-02
3.31E-02
3.34E-02
3.39E-02
3.37E-02
3.35E-02
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
181
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 5V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.88. Plot of Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
182
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.88. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.42E-02
3.42E-02
3.35E-02
3.42E-02
3.35E-02
3.35E-02
3.40E-02
3.34E-02
3.37E-02
3.36E-02
3.37E-02
3.35E-02
10
3.46E-02
3.46E-02
3.38E-02
3.47E-02
3.38E-02
3.39E-02
3.42E-02
3.38E-02
3.40E-02
3.42E-02
3.38E-02
3.35E-02
20
3.49E-02
3.49E-02
3.39E-02
3.51E-02
3.39E-02
3.39E-02
3.45E-02
3.39E-02
3.41E-02
3.44E-02
3.39E-02
3.36E-02
30
3.50E-02
3.50E-02
3.41E-02
3.53E-02
3.40E-02
3.43E-02
3.48E-02
3.43E-02
3.44E-02
3.46E-02
3.41E-02
3.38E-02
50
3.51E-02
3.50E-02
3.41E-02
3.52E-02
3.43E-02
3.44E-02
3.49E-02
3.44E-02
3.47E-02
3.51E-02
3.39E-02
3.35E-02
60
3.51E-02
3.52E-02
3.42E-02
3.54E-02
3.43E-02
3.45E-02
3.51E-02
3.45E-02
3.46E-02
3.49E-02
3.39E-02
3.36E-02
70
3.50E-02
3.50E-02
3.40E-02
3.52E-02
3.42E-02
3.42E-02
3.47E-02
3.40E-02
3.44E-02
3.46E-02
3.39E-02
3.38E-02
3.39E-02
3.82E-04
3.49E-02
3.29E-02
3.43E-02
4.61E-04
3.56E-02
3.30E-02
3.45E-02
5.67E-04
3.61E-02
3.30E-02
3.47E-02
5.93E-04
3.63E-02
3.31E-02
3.47E-02
5.19E-04
3.62E-02
3.33E-02
3.48E-02
5.78E-04
3.64E-02
3.33E-02
3.47E-02
5.65E-04
3.62E-02
3.31E-02
3.36E-02
3.40E-02
3.42E-02
3.45E-02
3.47E-02
3.47E-02
3.44E-02
2.36E-04
2.03E-04
2.80E-04
2.14E-04
3.01E-04
2.78E-04
2.71E-04
3.43E-02
3.46E-02
3.49E-02
3.51E-02
3.55E-02
3.55E-02
3.51E-02
3.30E-02
3.35E-02
3.34E-02
3.39E-02
3.39E-02
3.40E-02
3.36E-02
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
1.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
183
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.89. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
184
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.89. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
7.41E-02
7.42E-02
7.12E-02
7.40E-02
7.28E-02
7.39E-02
7.34E-02
7.27E-02
7.34E-02
7.34E-02
7.32E-02
7.34E-02
10
7.45E-02
7.46E-02
7.18E-02
7.42E-02
7.33E-02
7.41E-02
7.39E-02
7.27E-02
7.36E-02
7.35E-02
7.32E-02
7.34E-02
20
7.52E-02
7.51E-02
7.28E-02
7.45E-02
7.35E-02
7.43E-02
7.41E-02
7.33E-02
7.34E-02
7.38E-02
7.37E-02
7.36E-02
30
7.54E-02
7.54E-02
7.31E-02
7.50E-02
7.39E-02
7.44E-02
7.47E-02
7.38E-02
7.45E-02
7.44E-02
7.37E-02
7.38E-02
50
7.57E-02
7.54E-02
7.28E-02
7.51E-02
7.39E-02
7.49E-02
7.44E-02
7.37E-02
7.44E-02
7.47E-02
7.37E-02
7.34E-02
60
7.57E-02
7.57E-02
7.29E-02
7.52E-02
7.43E-02
7.44E-02
7.47E-02
7.38E-02
7.45E-02
7.46E-02
7.38E-02
7.36E-02
70
7.57E-02
7.55E-02
7.30E-02
7.51E-02
7.43E-02
7.44E-02
7.42E-02
7.32E-02
7.43E-02
7.42E-02
7.40E-02
7.36E-02
7.33E-02
1.28E-03
7.68E-02
6.97E-02
7.37E-02
1.15E-03
7.68E-02
7.05E-02
7.42E-02
1.03E-03
7.70E-02
7.14E-02
7.45E-02
1.02E-03
7.74E-02
7.17E-02
7.46E-02
1.19E-03
7.78E-02
7.13E-02
7.48E-02
1.18E-03
7.80E-02
7.15E-02
7.47E-02
1.09E-03
7.77E-02
7.17E-02
7.34E-02
7.36E-02
7.38E-02
7.44E-02
7.44E-02
7.44E-02
7.40E-02
3.99E-04
5.20E-04
4.46E-04
3.28E-04
4.30E-04
3.63E-04
5.03E-04
7.44E-02
7.50E-02
7.50E-02
7.53E-02
7.56E-02
7.54E-02
7.54E-02
7.23E-02
7.22E-02
7.26E-02
7.35E-02
7.32E-02
7.34E-02
7.27E-02
2.00E-01
2.00E-01
2.00E-01
2.00E-01
2.00E-01
2.00E-01
2.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
185
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V)
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.90. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
186
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.90. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
7.50E-02
7.48E-02
7.28E-02
7.47E-02
7.34E-02
7.37E-02
7.43E-02
7.33E-02
7.40E-02
7.38E-02
7.36E-02
7.32E-02
10
7.52E-02
7.55E-02
7.33E-02
7.52E-02
7.38E-02
7.42E-02
7.42E-02
7.37E-02
7.43E-02
7.43E-02
7.38E-02
7.35E-02
20
7.56E-02
7.59E-02
7.35E-02
7.59E-02
7.37E-02
7.41E-02
7.48E-02
7.40E-02
7.42E-02
7.44E-02
7.40E-02
7.40E-02
30
7.62E-02
7.61E-02
7.41E-02
7.60E-02
7.47E-02
7.49E-02
7.55E-02
7.44E-02
7.49E-02
7.51E-02
7.45E-02
7.40E-02
50
7.62E-02
7.64E-02
7.42E-02
7.63E-02
7.46E-02
7.47E-02
7.55E-02
7.46E-02
7.52E-02
7.52E-02
7.42E-02
7.42E-02
60
7.63E-02
7.60E-02
7.39E-02
7.61E-02
7.47E-02
7.49E-02
7.53E-02
7.45E-02
7.54E-02
7.53E-02
7.45E-02
7.41E-02
70
7.59E-02
7.57E-02
7.39E-02
7.61E-02
7.47E-02
7.44E-02
7.52E-02
7.43E-02
7.48E-02
7.51E-02
7.44E-02
7.41E-02
7.41E-02
9.81E-04
7.68E-02
7.14E-02
7.46E-02
9.86E-04
7.73E-02
7.19E-02
7.49E-02
1.20E-03
7.82E-02
7.16E-02
7.54E-02
9.76E-04
7.81E-02
7.27E-02
7.55E-02
1.07E-03
7.85E-02
7.26E-02
7.54E-02
1.07E-03
7.83E-02
7.25E-02
7.52E-02
9.25E-04
7.78E-02
7.27E-02
7.38E-02
7.41E-02
7.43E-02
7.50E-02
7.50E-02
7.51E-02
7.47E-02
3.94E-04
2.61E-04
3.33E-04
3.79E-04
4.02E-04
4.01E-04
4.05E-04
7.49E-02
7.48E-02
7.52E-02
7.60E-02
7.61E-02
7.62E-02
7.59E-02
7.28E-02
7.34E-02
7.34E-02
7.39E-02
7.39E-02
7.40E-02
7.36E-02
2.00E-01
2.00E-01
2.00E-01
2.00E-01
2.00E-01
2.00E-01
2.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
187
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 5V #1 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.91. Plot of Positive Short-Circuit Current @ 5V #1 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
188
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.91. Raw data for Positive Short-Circuit Current @ 5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 5V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-2.59E-02
-2.76E-02
-2.58E-02
-2.67E-02
-2.49E-02
-2.57E-02
-2.57E-02
-2.62E-02
-2.74E-02
-2.48E-02
-2.60E-02
-2.57E-02
10
-2.56E-02
-2.71E-02
-2.54E-02
-2.62E-02
-2.45E-02
-2.54E-02
-2.55E-02
-2.59E-02
-2.72E-02
-2.46E-02
-2.60E-02
-2.57E-02
20
-2.54E-02
-2.70E-02
-2.53E-02
-2.60E-02
-2.44E-02
-2.53E-02
-2.53E-02
-2.57E-02
-2.70E-02
-2.44E-02
-2.60E-02
-2.58E-02
30
-2.54E-02
-2.69E-02
-2.53E-02
-2.61E-02
-2.43E-02
-2.52E-02
-2.54E-02
-2.57E-02
-2.70E-02
-2.44E-02
-2.61E-02
-2.59E-02
50
-2.50E-02
-2.65E-02
-2.50E-02
-2.56E-02
-2.40E-02
-2.50E-02
-2.50E-02
-2.53E-02
-2.67E-02
-2.40E-02
-2.61E-02
-2.58E-02
60
-2.51E-02
-2.66E-02
-2.50E-02
-2.57E-02
-2.40E-02
-2.50E-02
-2.51E-02
-2.53E-02
-2.68E-02
-2.40E-02
-2.61E-02
-2.58E-02
70
-2.52E-02
-2.67E-02
-2.52E-02
-2.59E-02
-2.42E-02
-2.53E-02
-2.54E-02
-2.58E-02
-2.71E-02
-2.44E-02
-2.61E-02
-2.58E-02
-2.62E-02
1.01E-03
-2.34E-02
-2.89E-02
-2.58E-02
9.67E-04
-2.31E-02
-2.84E-02
-2.56E-02
9.59E-04
-2.30E-02
-2.82E-02
-2.56E-02
9.78E-04
-2.29E-02
-2.83E-02
-2.52E-02
9.18E-04
-2.27E-02
-2.77E-02
-2.53E-02
9.36E-04
-2.27E-02
-2.79E-02
-2.54E-02
9.61E-04
-2.28E-02
-2.81E-02
-2.60E-02 -2.57E-02 -2.55E-02 -2.55E-02 -2.52E-02 -2.52E-02 -2.56E-02
9.46E-04
9.45E-04
9.60E-04
9.76E-04
9.87E-04
9.88E-04
9.58E-04
-2.34E-02 -2.31E-02 -2.29E-02 -2.29E-02 -2.25E-02 -2.25E-02 -2.30E-02
-2.86E-02 -2.83E-02 -2.82E-02 -2.82E-02 -2.79E-02 -2.79E-02 -2.82E-02
-1.25E-02 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
189
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 5V #2 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.92. Plot of Positive Short-Circuit Current @ 5V #2 (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
190
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.92. Raw data for Positive Short-Circuit Current @ 5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 5V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
-2.60E-02
-2.81E-02
-2.62E-02
-2.73E-02
-2.49E-02
-2.54E-02
-2.59E-02
-2.65E-02
-2.73E-02
-2.52E-02
-2.58E-02
-2.59E-02
10
-2.56E-02
-2.76E-02
-2.59E-02
-2.68E-02
-2.45E-02
-2.52E-02
-2.56E-02
-2.62E-02
-2.70E-02
-2.50E-02
-2.58E-02
-2.59E-02
20
-2.55E-02
-2.75E-02
-2.57E-02
-2.66E-02
-2.44E-02
-2.50E-02
-2.54E-02
-2.60E-02
-2.69E-02
-2.48E-02
-2.58E-02
-2.60E-02
30
-2.55E-02
-2.75E-02
-2.57E-02
-2.67E-02
-2.43E-02
-2.50E-02
-2.55E-02
-2.60E-02
-2.69E-02
-2.48E-02
-2.59E-02
-2.61E-02
50
-2.51E-02
-2.69E-02
-2.54E-02
-2.62E-02
-2.40E-02
-2.47E-02
-2.51E-02
-2.56E-02
-2.66E-02
-2.44E-02
-2.59E-02
-2.60E-02
60
-2.52E-02
-2.70E-02
-2.55E-02
-2.63E-02
-2.41E-02
-2.48E-02
-2.52E-02
-2.56E-02
-2.66E-02
-2.44E-02
-2.59E-02
-2.60E-02
70
-2.53E-02
-2.72E-02
-2.56E-02
-2.65E-02
-2.42E-02
-2.51E-02
-2.55E-02
-2.61E-02
-2.69E-02
-2.48E-02
-2.59E-02
-2.61E-02
-2.65E-02
1.24E-03
-2.31E-02
-2.99E-02
-2.61E-02
1.18E-03
-2.29E-02
-2.93E-02
-2.59E-02
1.17E-03
-2.27E-02
-2.92E-02
-2.59E-02
1.19E-03
-2.27E-02
-2.92E-02
-2.55E-02
1.10E-03
-2.25E-02
-2.85E-02
-2.56E-02
1.13E-03
-2.25E-02
-2.87E-02
-2.58E-02
1.18E-03
-2.25E-02
-2.90E-02
-2.61E-02 -2.58E-02 -2.56E-02 -2.56E-02 -2.53E-02 -2.53E-02 -2.57E-02
8.30E-04
8.18E-04
8.29E-04
8.47E-04
8.42E-04
8.44E-04
8.35E-04
-2.38E-02 -2.36E-02 -2.34E-02 -2.33E-02 -2.30E-02 -2.30E-02 -2.34E-02
-2.83E-02 -2.81E-02 -2.79E-02 -2.79E-02 -2.76E-02 -2.76E-02 -2.80E-02
-1.25E-02 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
191
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 5V #1 (A)
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.93. Plot of Negative Short-Circuit Current @ 5V #1 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
192
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.93. Raw data for Negative Short-Circuit Current @ 5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 5V #1 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
4.94E-02
5.19E-02
5.33E-02
5.20E-02
5.06E-02
5.10E-02
5.17E-02
5.22E-02
5.23E-02
5.10E-02
5.13E-02
5.16E-02
10
4.90E-02
5.15E-02
5.28E-02
5.16E-02
5.01E-02
5.07E-02
5.13E-02
5.18E-02
5.19E-02
5.06E-02
5.12E-02
5.15E-02
20
4.86E-02
5.11E-02
5.25E-02
5.12E-02
4.98E-02
5.05E-02
5.12E-02
5.16E-02
5.17E-02
5.04E-02
5.10E-02
5.13E-02
30
4.80E-02
5.06E-02
5.19E-02
5.07E-02
4.93E-02
4.99E-02
5.06E-02
5.11E-02
5.12E-02
4.99E-02
5.06E-02
5.08E-02
50
4.83E-02
5.07E-02
5.21E-02
5.08E-02
4.94E-02
5.00E-02
5.06E-02
5.10E-02
5.12E-02
4.98E-02
5.07E-02
5.10E-02
60
4.80E-02
5.05E-02
5.18E-02
5.06E-02
4.92E-02
4.99E-02
5.06E-02
5.10E-02
5.12E-02
4.99E-02
5.07E-02
5.11E-02
70
4.82E-02
5.06E-02
5.21E-02
5.07E-02
4.93E-02
5.01E-02
5.07E-02
5.11E-02
5.12E-02
4.99E-02
5.06E-02
5.08E-02
5.14E-02
1.48E-03
5.55E-02
4.74E-02
5.10E-02
1.45E-03
5.50E-02
4.70E-02
5.07E-02
1.49E-03
5.47E-02
4.66E-02
5.01E-02
1.49E-03
5.42E-02
4.60E-02
5.03E-02
1.45E-03
5.42E-02
4.63E-02
5.00E-02
1.47E-03
5.40E-02
4.60E-02
5.02E-02
1.48E-03
5.43E-02
4.61E-02
5.16E-02
5.13E-02
5.11E-02
5.05E-02
5.05E-02
5.05E-02
5.06E-02
6.25E-04
6.20E-04
6.08E-04
6.25E-04
6.22E-04
6.11E-04
6.04E-04
5.33E-02
5.30E-02
5.27E-02
5.22E-02
5.22E-02
5.22E-02
5.22E-02
4.99E-02
4.96E-02
4.94E-02
4.88E-02
4.88E-02
4.88E-02
4.89E-02
1.25E-02
8.00E-03
8.00E-03
8.00E-03
8.00E-03
8.00E-03
8.00E-03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
193
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 5V #2 (A)
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.94. Plot of Negative Short-Circuit Current @ 5V #2 (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
194
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
Table 5.94. Raw data for Negative Short-Circuit Current @ 5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 5V #2 (A)
Device
45
46
47
60
61
62
63
64
65
77
99
100
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24-hr
Anneal
168-hr
Anneal
0
4.89E-02
5.14E-02
5.20E-02
5.08E-02
4.96E-02
5.03E-02
5.07E-02
5.11E-02
5.17E-02
5.00E-02
5.06E-02
5.07E-02
10
4.84E-02
5.10E-02
5.17E-02
5.04E-02
4.91E-02
5.00E-02
5.05E-02
5.07E-02
5.13E-02
4.95E-02
5.04E-02
5.06E-02
20
4.80E-02
5.07E-02
5.13E-02
5.00E-02
4.89E-02
4.98E-02
5.02E-02
5.05E-02
5.11E-02
4.93E-02
5.02E-02
5.04E-02
30
4.76E-02
5.01E-02
5.08E-02
4.95E-02
4.83E-02
4.93E-02
4.98E-02
5.00E-02
5.06E-02
4.89E-02
4.97E-02
5.00E-02
50
4.77E-02
5.03E-02
5.08E-02
4.96E-02
4.84E-02
4.93E-02
4.98E-02
4.99E-02
5.06E-02
4.88E-02
4.99E-02
5.01E-02
60
4.75E-02
5.00E-02
5.07E-02
4.94E-02
4.83E-02
4.93E-02
4.97E-02
4.99E-02
5.06E-02
4.89E-02
5.00E-02
5.01E-02
70
4.76E-02
5.02E-02
5.08E-02
4.95E-02
4.84E-02
4.94E-02
4.98E-02
5.01E-02
5.06E-02
4.89E-02
4.99E-02
5.00E-02
5.06E-02
1.30E-03
5.41E-02
4.70E-02
5.01E-02
1.33E-03
5.38E-02
4.65E-02
4.98E-02
1.34E-03
5.35E-02
4.61E-02
4.92E-02
1.31E-03
5.28E-02
4.56E-02
4.94E-02
1.31E-03
5.30E-02
4.58E-02
4.92E-02
1.30E-03
5.27E-02
4.56E-02
4.93E-02
1.32E-03
5.29E-02
4.57E-02
5.08E-02
5.04E-02
5.02E-02
4.97E-02
4.97E-02
4.97E-02
4.98E-02
6.47E-04
6.84E-04
6.61E-04
6.54E-04
6.90E-04
6.61E-04
6.58E-04
5.25E-02
5.23E-02
5.20E-02
5.15E-02
5.16E-02
5.15E-02
5.16E-02
4.90E-02
4.85E-02
4.84E-02
4.79E-02
4.78E-02
4.79E-02
4.79E-02
1.25E-02
8.00E-03
8.00E-03
8.00E-03
8.00E-03
8.00E-03
8.00E-03
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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6.0. Summary / Conclusions
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source.
Samples of the RH1498MW Dual Precision Op Amp described in this report were irradiated biased with
a split 25V supply and unbiased (all leads tied to ground). The devices were irradiated to a maximum
total ionizing dose level of 50krad(Si) with a pre-rad baseline reading as well as incremental readings at
10, 20, and 30krad(Si). Electrical testing occurred within one hour following the end of each irradiation
segment. For intermediate irradiations, the units were tested and returned to total dose exposure within
two hours from the end of the previous radiation increment. In addition, all units-under-test received a
24hr room temperature and 168hr 100°C anneal, using the same bias conditions as the radiation
exposure.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814
using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were
selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the
qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be
met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces
irradiated under electrical bias shall pass the specification value. The units irradiated without electrical
bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated
under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Using the conditions stated above, the RH1498MW Dual Precision Op Amp (from the lot date code
identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to
50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits.
Note that the data for the units-under-test irradiated in the unbiased condition and the KTL statistics
presented in this report are for reference only and are not used for the determination of “PASS/FAIL”
for the lot. Further, the data in this report can be analyzed along with the low dose rate report titled
“Total Ionizing Dose (TID) Testing of the RH1498MW Dual Precision Op Amp for Linear Technology”
to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
Biased Samples:
Pin
Function
Connection / Bias
1
OUT A
To Pin 2 via 5kΩ & 40pF, in Parallel
2
-INPUT A
To Pin 1 via 5kΩ & 40pF, in Parallel
3
+INPUT A
To 8V via 5kΩ Resistor
4
NC
NC
5
V-
To -15V using 0.1μF Decoupling
6
NC
NC
7
+INPUT B
To 8V via 5kΩ Resistor
8
-INPUT B
To Pin 9 via 5kΩ & 40pF, in Parallel
9
OUT B
To Pin 8 via 5kΩ & 40pF, in Parallel
10
V+
To +15V using 0.1μF Decoupling
Unbiased Samples:
Pin
Function
Connection / Bias
1
OUT A
GND
2
-INPUT A
GND
3
+INPUT A
GND
4
NC
GND
5
V-
GND
6
NC
GND
7
+INPUT B
GND
8
-INPUT B
GND
9
OUT B
GND
10
V+
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from LINEAR TECHNOLOGY CORPORATION, RH1498M Datasheet.
Figure B.2. W package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY
CORPORATION RH1498M Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1498 DUT board. The measured parameters and test conditions are
shown in Tables C.1 (VS=±15V) and C.2 (VS=5V).
A listing of the measurement precision/resolution for each parameter is shown in Tables C.3 (VS=±15V)
and C.4 (VS=5V). The precision/resolution values were obtained either from test data or from the DAC
resolution of the LTS-2020. To generate the precision/resolution shown in Table C.4 through C.6, one
of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to
obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL
statistics were applied to the measured standard deviation to generate the final measurement range. This
value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where
the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation.
If necessary, larger samples sizes could be used to qualify these parameters using an “attributes”
approach.
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Table C.1. Measured parameters and test conditions for VS=±15V.
TEST DESCRIPTION
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-2)
Input Offset Current (Op Amp 1-2)
+ Input Bias Current (Op Amp 1-2)
- Input Bias Current (Op Amp 1-2)
Input Offset Voltage (Op Amp 1-2)
Input Offset Current (Op Amp 1-2)
+ Input Bias Current (Op Amp 1-2)
- Input Bias Current (Op Amp 1-2)
Input Offset Voltage (Op Amp 1-2)
Input Offset Current (Op Amp 1-2)
+ Input Bias Current (Op Amp 1-2)
- Input Bias Current (Op Amp 1-2)
Large Signal Voltage Gain (Op Amp 1-2)
Large Signal Voltage Gain (Op Amp 1-2)
CMRR (Op Amp 1-2)
CMRR Matching
PSRR (Op Amp 1-2)
PSRR Matching
Output Voltage Swing High (Op Amp 1-2)
Output Voltage Swing High (Op Amp 1-2)
Output Voltage Swing High (Op Amp 1-2)
Output Voltage Swing Low (Op Amp 1-2)
Output Voltage Swing Low (Op Amp 1-2)
Output Voltage Swing Low (Op Amp 1-2)
+VS Short-Circuit Current (Op Amp 1-2)
-VS Short-Circuit Current (Op Amp 1-2)
TEST CONDITIONS
V+=15V and V-=-15V
V+=15V and V-=-15V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=-15V
V+=15V, V-=-15V and VCM=-15V
V+=15V, V-=-15V and VCM=-15V
V+=15V, V-=-15V and VCM=-15V
RL = 10kΩ, VO = ±14.5V
RL = 2kΩ, VO = ±10V
VS=±15V, VCM=±15V
VS=±15V, VCM=±15V
VS=±2V to VS=±16V
VS=±2V to VS=±16V
VS=±15V, No Load
VS=±15V, ISINK=1mA
VS=±15V, ISINK=10mA
VS=±15V, No Load
VS=±15V, ISINK=1mA
VS=±15V, ISINK=10mA
VS=±15V
VS=±15V
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Table C.2. Measured parameters and test conditions for VS=5V.
TEST DESCRIPTION
TEST CONDITIONS
Positive Supply Current
V+=5V and V-=0V
Negative Supply Current
V+=5V and V-=0V
Input Offset Voltage (Op Amp 1-2)
V+=5V, V-=0V and VCM=0V
Input Offset Current (Op Amp 1-2)
V+=5V, V-=0V and VCM=0V
+ Input Bias Current (Op Amp 1-2)
V+=5V, V-=0V and VCM=0V
- Input Bias Current (Op Amp 1-2)
V+=5V, V-=0V and VCM=0V
Input Offset Voltage (Op Amp 1-2)
V+=5V, V-=0V and VCM=5V
Input Offset Current (Op Amp 1-2)
V+=5V, V-=0V and VCM=5V
+ Input Bias Current (Op Amp 1-2)
V+=5V, V-=0V and VCM=5V
- Input Bias Current (Op Amp 1-2)
V+=5V, V-=0V and VCM=5V
Large Signal Voltage Gain (Op Amp 1-2) RL = 10kΩ, VO=75mV to 4.8V
CMRR (Op Amp 1-2)
VS=5V, VCM=0-5V
CMRR Matching
VS=5V, VCM=0-5V
PSRR (Op Amp 1-2)
VS=4.5V to VS=12V
PSRR Matching
VS=4.5V to VS=12V
Output Voltage Swing High (Op Amp 1-2)
VS=5V, No Load
Output Voltage Swing High (Op Amp 1-2)
VS=5V, ISINK=1mA
Output Voltage Swing High (Op Amp 1-2)
VS=5V, ISINK=2.5mA
Output Voltage Swing Low (Op Amp 1-2)
VS=5V, No Load
Output Voltage Swing Low (Op Amp 1-2)
VS=5V, ISINK=1mA
Output Voltage Swing Low (Op Amp 1-2)
VS=5V, ISINK=2.5mA
+VS Short-Circuit Current (Op Amp 1-2)
VS=5V
-VS Short-Circuit Current (Op Amp 1-2)
VS=5V
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Table C.3. Measured parameters, pre-irradiation specifications and measurement resolutions
for VS=±15V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Measured Parameter
Positive Supply Current
Negative Supply Current
Input Offset Voltage
Input Offset Current
+ Input Bias Current
- Input Bias Current
Large Signal Voltage Gain (10kΩ Load)
Large Signal Voltage Gain (2kΩ Load)
Common Mode Rejection Ratio
Common Mode Rejection Ratio Matching
Power Supply Rejection Ratio
Power Supply Rejection Ratio Matching
Output Voltage Swing High (No Load)
Output Voltage Swing High (ISINK=1mA)
Output Voltage Swing High (ISINK=10mA)
Output Voltage Swing Low (No Load)
Output Voltage Swing Low (ISINK=1mA)
Output Voltage Swing Low (ISINK=10mA)
+VS Short Circuit Current
-VS Short Circuit Current
5mA
-5mA
±800μV
±70nA
±715nA
±715nA
1000V/mV
500V/mV
90dB
84dB
90dB
83dB
10mV
150mV
800mV
30mV
100mV
500mV
±15mA
±15mA
± 1.36E-04A
± 1.28E-04A
± 3.66E-05V
± 1.39E-09A
± 2.12E-08A
± 1.75E-08A
± 6.74E+02V/mV
± 1.12E+02V/mV
± 4.88E-01dB
± 1.13E-01dB
± 8.81E-01dB
± 2.52E-01dB
± 1.67E-04V
± 1.06E-03V
± 4.71E-03V
± 5.82E-04V
± 8.60E-04V
± 3.67E-03V
± 1.28E-03A
± 1.75E-03A
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Table C.4. Measured parameters, pre-irradiation specifications and measurement resolutions
for VS=5V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Measured Parameter
Positive Supply Current
Negative Supply Current
Input Offset Voltage
Input Offset Current
+ Input Bias Current
- Input Bias Current
Large Signal Voltage Gain (10kΩ Load)
Common Mode Rejection Ratio
Common Mode Rejection Ratio Matching
Power Supply Rejection Ratio
Power Supply Rejection Ratio Matching
Output Voltage Swing High (No Load)
Output Voltage Swing High (ISINK=1mA)
Output Voltage Swing High (ISINK=2.5mA)
Output Voltage Swing Low (No Load)
Output Voltage Swing Low (ISINK=1mA)
Output Voltage Swing Low (ISINK=2.5mA)
+VS Short Circuit Current
-VS Short Circuit Current
4.4mA
-4.4mA
±800μV
±65nA
±650nA
±650nA
600V/mV
76dB
75dB
88dB
82dB
10mV
150mV
250mV
30mV
100mV
200mV
±12.5mA
±12.5mA
± 8.71E-06A
± 8.71E-06A
± 2.67E-06V
± 1.08E-10A
± 3.04E-09A
± 3.27E-09A
± 2.43E+02V/mV
± 2.24E-01dB
± 8.27E-02dB
± 4.72E-01dB
± 2.71E-01dB
± 2.28E-04V
± 2.53E-04V
± 4.10E-04V
± 1.21E-04V
± 1.70E-04V
± 2.53E-04V
± 3.34E-05A
±9.72E-05A
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Appendix D: List of Figures used in Section 5 (Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
Positive Supply Current (A)
Negative Supply Current (A)
Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V)
Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V)
Input Offset Current @ +/- 15V, VCM= 0 V #1 (A)
Input Offset Current @ +/- 15V, VCM= 0 V #2 (A)
Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V)
Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V)
Input Offset Current @ +/- 15V, VCM= 15 V #1 (A)
Input Offset Current @ +/- 15V, VCM= 15 V #2 (A)
Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V)
Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V)
Input Offset Current @ +/- 15V, VCM= -15 V #1 (A)
Input Offset Current @ +/- 15V, VCM= -15 V #2 (A)
Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV)
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV)
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV)
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV)
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB)
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB)
Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB)
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB)
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB)
Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB)
Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V)
Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V)
Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V)
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5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
5.63
5.64
5.65
5.66
5.67
5.68
5.69
5.70
5.71
5.72
5.73
5.74
5.75
5.76
5.77
5.78
5.79
5.80
Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V)
Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V)
Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V)
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V)
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V)
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V)
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V)
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V)
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V)
Positive Short-Circuit Current @ +/- 15 V #1 (A)
Positive Short-Circuit Current @ +/- 15 V #2 (A)
Negative Short-Circuit Current @ +/- 15 V #1 (A)
Negative Short-Circuit Current @ +/- 15 V #2 (A)
Positive Supply Current @ 5V (A)
Negative Supply Current @ 5V (A)
Input Offset Voltage @ 5V, VCM=0V #1 (V)
Input Offset Voltage @ 5V, VCM=0V #2 (V)
Input Offset Current @ 5V, VCM=0V #1 (A)
Input Offset Current @ 5V, VCM=0V #2 (A)
Positive Input Bias Current @ 5V, VCM=0V #1 (A)
Positive Input Bias Current @ 5V, VCM=0V #2 (A)
Negative Input Bias Current @ 5V, VCM=0V #1 (A)
Negative Input Bias Current @ 5V, VCM=0V #2 (A)
Input Offset Voltage @ 5V, VCM=5V #1 (V)
Input Offset Voltage @ 5V, VCM=5V #2 (V)
Input Offset Current @ 5V, VCM=5V #1 (A)
Input Offset Current @ 5V, VCM=5V #2 (A)
Positive Input Bias Current @ 5V, VCM=5V #1 (A)
Positive Input Bias Current @ 5V, VCM=5V #2 (A)
Negative Input Bias Current @ 5V, VCM=5V #1 (A)
Negative Input Bias Current @ 5V, VCM=5V #2 (A)
Large Signal Voltage Gain @ 5V #1 (V/mV)
Large Signal Voltage Gain @ 5V #2 (V/mV)
Common Mode Rejection Ratio @ 5V #1 (dB)
Common Mode Rejection Ratio @ 5V #2 (dB)
Common Mode Rejection Ratio Matching @ 5V (dB)
Power Supply Rejection Ratio @ 4.5V-12V #1 (dB)
Power Supply Rejection Ratio @ 4.5V-12V #2 (dB)
Power Supply Rejection Ratio Matching @ 4.5V-12V (dB)
Output Voltage Swing High IL= 0mA @ 5V #1 (V)
Output Voltage Swing High IL= 0mA @ 5V #2 (V)
An ISO 9001:2008 and DSCC Certified Company
206
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
09-579 100408 R1.0
5.81
5.82
5.83
5.84
5.85
5.86
5.87
5.88
5.89
5.90
5.91
5.92
5.93
5.94
Output Voltage Swing High IL= 1mA @ 5V #1 (V)
Output Voltage Swing High IL= 1mA @ 5V #2 (V)
Output Voltage Swing High IL= 2.5mA @ 5V #1 (V)
Output Voltage Swing High IL= 2.5mA @ 5V #2 (V)
Output Voltage Swing Low IL= 0mA @ 5V #1 (V)
Output Voltage Swing Low IL= 0mA @ 5V #2 (V)
Output Voltage Swing Low IL= 1mA @ 5V #1 (V)
Output Voltage Swing Low IL= 1mA @ 5V #2 (V)
Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V)
Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V)
Positive Short-Circuit Current @ 5V #1 (A)
Positive Short-Circuit Current @ 5V #2 (A)
Negative Short-Circuit Current @ 5V #1 (A)
Negative Short-Circuit Current @ 5V #2 (A)
An ISO 9001:2008 and DSCC Certified Company
207
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
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