ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1498MW Dual Precision Op Amp for Linear Technology Customer: Linear Technology (PO# 54873L) RAD Job Number: 09-579 Part Type Tested: Linear Technology RH1498MW Dual Precision Op Amp Commercial Part Number: RH1498MW Traceability Information: Lot Date Code: 0931A, Assy Lot# 533036.1, Fab Lot# W10739896.1, Wafer 9 (Obtained from Linear Technology PO 54873L). See photograph of unit under test in Appendix A. Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 control units. Serial numbers 45-47, 60, and 61 were biased during irradiation, serial numbers 62-65, and 77 were unbiased during irradiation and serial numbers 99 and 100 were used as controls. See Appendix B for the radiation bias connection table. External Traveler: None Required Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD. TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si). TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical measurements shall be made following each anneal increment. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1498 DUT Board Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the GB-150 low dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5 Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C ± 6°C per MIL-STD-883. Low Dose Rate Test Result: PASSED. Units Passed to 50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits. Further the units do not exhibit ELDRS as defined in the current test method. An ISO 9001:2008 and DSCC Certified Company 1 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10 years a number of accelerating techniques have been examined, including an elevated temperature anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating at various temperatures. However, none of these techniques have proven useful across the wide variety of linear and/or mixed signal devices used in spaceborne applications. The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test at 10mrad(Si)/s. 2.0. Radiation Test Apparatus The ELDRS testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance from the source. For the low dose rate ELDRS testing described in this report, the devices are placed approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60 irradiator at RAD’s Longmire Laboratory facility. An ISO 9001:2008 and DSCC Certified Company 2 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4meters. An ISO 9001:2008 and DSCC Certified Company 3 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1498MW Dual Precision Op Amp described in this final report was tested using two bias conditions, biased with a split 15V supply and all pins tied to ground, see Appendix B for details on biasing conditions. These bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum box was determined based on TLD dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work was 10mrad(Si)/s with a precision of ±5%. 4.0. Tested Parameters The following parameters were tested during the course of this work: Measured parameters and test conditions for VS=±15V: 1. 2. 3. 4. Positive Supply Current Negative Supply Current Input Offset Voltage (Op Amp 1-2) Input Offset Current (Op Amp 1-2) An ISO 9001:2008 and DSCC Certified Company 4 ELDRS Report 09-579 100408 R1.0 5. + Input Bias Current (Op Amp 1-2) 6. - Input Bias Current (Op Amp 1-2) 7. Input Offset Voltage (Op Amp 1-2) 8. Input Offset Current (Op Amp 1-2) 9. + Input Bias Current (Op Amp 1-2) 10. - Input Bias Current (Op Amp 1-2) 11. Input Offset Voltage (Op Amp 1-2) 12. Input Offset Current (Op Amp 1-2) 13. + Input Bias Current (Op Amp 1-2) 14. - Input Bias Current (Op Amp 1-2) 15. Large Signal Voltage Gain (Op Amp 1-2) 16. Large Signal Voltage Gain (Op Amp 1-2) 17. CMRR (Op Amp 1-2) 18. CMRR Matching 19. PSRR (Op Amp 1-2) 20. PSRR Matching 21. Output Voltage Swing High (Op Amp 1-2) 22. Output Voltage Swing High (Op Amp 1-2) 23. Output Voltage Swing High (Op Amp 1-2) 24. Output Voltage Swing Low (Op Amp 1-2) 25. Output Voltage Swing Low (Op Amp 1-2) 26. Output Voltage Swing Low (Op Amp 1-2) 27. +VS Short-Circuit Current (Op Amp 1-2) 28. -VS Short-Circuit Current (Op Amp 1-2) Measured parameters and test conditions for VS=5V: 29. Positive Supply Current 30. Negative Supply Current 31. Input Offset Voltage (VCM=0) 32. Input Offset Voltage (VCM=5) 33. Input Offset Current (VCM=0) 34. Input Offset Current (VCM=5) 35. + Input Bias Current (VCM=0) 36. + Input Bias Current (VCM=5) 37. - Input Bias Current (VCM=0) 38. - Input Bias Current (VCM=5) 39. Large Signal Voltage Gain (10kΩ Load) 40. Common Mode Rejection Ratio 41. Common Mode Rejection Ratio Matching 42. Power Supply Rejection Ratio An ISO 9001:2008 and DSCC Certified Company 5 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 43. Power Supply Rejection Ratio Matching 44. Output Voltage Swing High (No Load) 45. Output Voltage Swing High (ISINK=1mA) 46. Output Voltage Swing High (ISINK=2.5mA) 47. Output Voltage Swing Low (No Load) 48. Output Voltage Swing Low (ISINK=1mA) 49. Output Voltage Swing Low (ISINK=2.5mA) 50. +VS Short Circuit Current 51. -VS Short Circuit Current Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a population representative of recent production runs. Smaller sample sizes may be used if agreed upon between the parties to the test. All of the selected devices shall have undergone appropriate elevated temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10 where the low dose rate test is considered Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test An ISO 9001:2008 and DSCC Certified Company 6 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 does not apply to parameters which exhibit changes that are within experimental error or whose values are below the pre-irradiation electrical specification limits at low dose rate at the specification dose. Therefore, the data in this report can be analyzed along with the low dose rate report titled “Total Ionizing Dose (TID) Testing of the RH1498MW Dual Precision Op Amp for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. 5.0. ELDRS Test Results Using the conditions stated above, the RH1498MW Dual Precision Op Amp (from the lot date code identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to 50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits. Note that the data for the units-under-test irradiated in the unbiased condition and the KTL statistics presented in this report are for reference only and are not used for the determination of “PASS/FAIL” for the lot. Figures 5.1 through 5.94 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.94 show the corresponding raw data for each of these parameters. In these data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. In addition to the radiation test results, the data plots and tables described above contain anneal data. The anneals are performed to better understand the underlying physical mechanisms responsible for radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change during the anneal. As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even after application of the KTL statistics and the control units, as expected, show no significant changes to any of the parameters throughout the course of the measurements. Therefore we can conclude that the observed degradation was due to the radiation exposure and not drift in the test equipment. An ISO 9001:2008 and DSCC Certified Company 7 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-03 Positive Supply Current (A) 5.00E-03 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.1. Plot of Positive Supply Current (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.1. Raw data for Positive Supply Current (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 0 3.81E-03 3.83E-03 3.51E-03 3.86E-03 3.79E-03 3.58E-03 3.70E-03 3.82E-03 3.80E-03 3.71E-03 3.76E-03 3.62E-03 10 3.80E-03 3.81E-03 3.49E-03 3.84E-03 3.77E-03 3.58E-03 3.70E-03 3.82E-03 3.80E-03 3.70E-03 3.76E-03 3.62E-03 20 3.79E-03 3.81E-03 3.49E-03 3.84E-03 3.77E-03 3.58E-03 3.70E-03 3.82E-03 3.82E-03 3.70E-03 3.78E-03 3.64E-03 30 3.80E-03 3.81E-03 3.49E-03 3.84E-03 3.77E-03 3.58E-03 3.71E-03 3.83E-03 3.81E-03 3.70E-03 3.79E-03 3.65E-03 50 3.78E-03 3.80E-03 3.47E-03 3.83E-03 3.75E-03 3.57E-03 3.70E-03 3.82E-03 3.81E-03 3.69E-03 3.79E-03 3.65E-03 24-hr Anneal 168-hr Anneal 60 3.78E-03 3.80E-03 3.47E-03 3.83E-03 3.75E-03 3.58E-03 3.70E-03 3.82E-03 3.81E-03 3.69E-03 3.79E-03 3.65E-03 70 3.79E-03 3.80E-03 3.48E-03 3.84E-03 3.76E-03 3.59E-03 3.71E-03 3.83E-03 3.81E-03 3.71E-03 3.79E-03 3.65E-03 Biased Statistics Average Biased 3.76E-03 3.74E-03 3.74E-03 3.74E-03 3.73E-03 3.73E-03 3.73E-03 Std Dev Biased 1.42E-04 1.43E-04 1.42E-04 1.43E-04 1.46E-04 1.46E-04 1.45E-04 Ps90%/90% (+KTL) Biased 4.15E-03 4.13E-03 4.13E-03 4.13E-03 4.13E-03 4.13E-03 4.13E-03 Ps90%/90% (-KTL) Biased 3.37E-03 3.35E-03 3.35E-03 3.35E-03 3.33E-03 3.33E-03 3.34E-03 Un-Biased Statistics Average Un-Biased 3.72E-03 3.72E-03 3.72E-03 3.73E-03 3.72E-03 3.72E-03 3.73E-03 Std Dev Un-Biased 9.55E-05 9.59E-05 1.00E-04 1.00E-04 1.02E-04 9.87E-05 9.59E-05 Ps90%/90% (+KTL) Un-Biased 3.98E-03 3.98E-03 4.00E-03 4.00E-03 4.00E-03 3.99E-03 3.99E-03 Ps90%/90% (-KTL) Un-Biased 3.46E-03 3.46E-03 3.45E-03 3.45E-03 3.44E-03 3.45E-03 3.47E-03 Specification MAX 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 Status PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 9 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 0.00E+00 Negative Supply Current (A) -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 -6.00E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 10 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.2. Raw data for Negative Supply Current (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 0 -3.82E-03 -3.84E-03 -3.52E-03 -3.87E-03 -3.80E-03 -3.59E-03 -3.71E-03 -3.84E-03 -3.81E-03 -3.71E-03 -3.77E-03 -3.63E-03 10 -3.80E-03 -3.82E-03 -3.50E-03 -3.85E-03 -3.78E-03 -3.58E-03 -3.71E-03 -3.82E-03 -3.81E-03 -3.71E-03 -3.77E-03 -3.63E-03 20 -3.80E-03 -3.82E-03 -3.50E-03 -3.85E-03 -3.78E-03 -3.59E-03 -3.71E-03 -3.83E-03 -3.83E-03 -3.71E-03 -3.79E-03 -3.65E-03 30 -3.81E-03 -3.82E-03 -3.50E-03 -3.85E-03 -3.78E-03 -3.60E-03 -3.72E-03 -3.84E-03 -3.82E-03 -3.71E-03 -3.80E-03 -3.66E-03 50 -3.79E-03 -3.81E-03 -3.48E-03 -3.84E-03 -3.76E-03 -3.58E-03 -3.71E-03 -3.82E-03 -3.81E-03 -3.70E-03 -3.80E-03 -3.66E-03 24-hr Anneal 168-hr Anneal 60 -3.79E-03 -3.80E-03 -3.48E-03 -3.83E-03 -3.76E-03 -3.59E-03 -3.71E-03 -3.82E-03 -3.81E-03 -3.70E-03 -3.80E-03 -3.66E-03 70 -3.79E-03 -3.81E-03 -3.49E-03 -3.85E-03 -3.76E-03 -3.60E-03 -3.72E-03 -3.84E-03 -3.82E-03 -3.72E-03 -3.80E-03 -3.66E-03 Biased Statistics Average Biased -3.77E-03 -3.75E-03 -3.75E-03 -3.75E-03 -3.74E-03 -3.73E-03 -3.74E-03 Std Dev Biased 1.42E-04 1.42E-04 1.42E-04 1.43E-04 1.46E-04 1.43E-04 1.44E-04 Ps90%/90% (+KTL) Biased -3.38E-03 -3.36E-03 -3.36E-03 -3.36E-03 -3.34E-03 -3.34E-03 -3.35E-03 Ps90%/90% (-KTL) Biased -4.16E-03 -4.14E-03 -4.14E-03 -4.14E-03 -4.14E-03 -4.12E-03 -4.13E-03 Un-Biased Statistics Average Un-Biased -3.73E-03 -3.73E-03 -3.73E-03 -3.74E-03 -3.72E-03 -3.73E-03 -3.74E-03 Std Dev Un-Biased 9.86E-05 9.71E-05 1.00E-04 9.65E-05 9.76E-05 9.40E-05 9.59E-05 Ps90%/90% (+KTL) Un-Biased -3.46E-03 -3.46E-03 -3.46E-03 -3.47E-03 -3.46E-03 -3.47E-03 -3.48E-03 Ps90%/90% (-KTL) Un-Biased -4.00E-03 -3.99E-03 -4.01E-03 -4.00E-03 -3.99E-03 -3.98E-03 -4.00E-03 Specification MIN -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 -5.00E-03 Status PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 11 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.3. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.3. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.16E-05 1.37E-04 -4.71E-05 -4.29E-05 -2.23E-04 -9.60E-05 -1.24E-05 4.09E-05 8.04E-05 1.73E-04 -6.65E-05 -2.20E-04 10 -5.80E-06 1.02E-04 -6.86E-05 -7.37E-05 -2.50E-04 -1.04E-04 -3.03E-05 2.27E-05 6.65E-05 1.62E-04 -6.73E-05 -2.18E-04 20 4.82E-06 1.13E-04 -6.29E-05 -6.59E-05 -2.37E-04 -1.02E-04 -3.01E-05 2.57E-05 7.22E-05 1.71E-04 -6.62E-05 -2.19E-04 30 8.93E-06 1.17E-04 -4.83E-05 -6.27E-05 -2.33E-04 -9.72E-05 -3.00E-05 3.04E-05 7.15E-05 1.74E-04 -6.36E-05 -2.17E-04 50 1.11E-05 1.19E-04 -4.49E-05 -6.21E-05 -2.42E-04 -9.87E-05 -3.13E-05 2.93E-05 7.18E-05 1.79E-04 -6.26E-05 -2.22E-04 60 1.03E-05 1.19E-04 -4.54E-05 -6.07E-05 -2.41E-04 -9.77E-05 -3.07E-05 2.58E-05 7.23E-05 1.78E-04 -6.17E-05 -2.23E-04 70 3.45E-05 9.88E-05 -7.43E-05 -7.15E-05 -2.34E-04 -9.15E-05 -2.30E-05 1.56E-06 6.00E-05 1.47E-04 -6.34E-05 -2.22E-04 -3.29E-05 1.30E-04 3.23E-04 -3.89E-04 -5.92E-05 1.28E-04 2.92E-04 -4.10E-04 -4.95E-05 1.28E-04 3.00E-04 -3.99E-04 -4.37E-05 1.27E-04 3.05E-04 -3.93E-04 -4.38E-05 1.31E-04 3.16E-04 -4.04E-04 -4.36E-05 1.31E-04 3.15E-04 -4.03E-04 -4.94E-05 1.27E-04 2.98E-04 -3.97E-04 3.72E-05 2.33E-05 2.74E-05 2.97E-05 3.01E-05 2.96E-05 1.87E-05 1.01E-04 1.00E-04 1.03E-04 1.03E-04 1.05E-04 1.05E-04 8.98E-05 3.13E-04 2.98E-04 3.10E-04 3.11E-04 3.19E-04 3.17E-04 2.65E-04 -2.39E-04 -2.51E-04 -2.55E-04 -2.52E-04 -2.59E-04 -2.57E-04 -2.27E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 13 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.4. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.4. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.77E-04 -5.60E-05 -1.09E-04 -1.89E-04 -3.32E-04 2.38E-05 3.61E-05 -1.11E-04 -3.92E-04 5.73E-05 4.95E-05 7.22E-05 10 1.55E-04 -7.41E-05 -1.52E-04 -2.19E-04 -3.64E-04 1.48E-05 2.14E-05 -1.00E-04 -4.03E-04 4.47E-05 5.01E-05 7.27E-05 20 1.61E-04 -6.67E-05 -1.49E-04 -2.12E-04 -3.43E-04 1.51E-05 2.44E-05 -7.54E-05 -4.01E-04 5.02E-05 5.23E-05 8.40E-05 30 1.65E-04 -6.33E-05 -1.49E-04 -2.10E-04 -3.46E-04 1.41E-05 2.62E-05 -4.52E-05 -4.06E-04 5.24E-05 5.36E-05 8.58E-05 50 1.65E-04 -6.09E-05 -1.53E-04 -2.06E-04 -3.43E-04 1.62E-05 2.31E-05 -1.22E-06 -4.04E-04 5.32E-05 5.20E-05 7.53E-05 60 1.65E-04 -6.15E-05 -1.53E-04 -2.06E-04 -3.43E-04 1.73E-05 2.21E-05 -5.08E-06 -4.03E-04 5.38E-05 5.08E-05 7.62E-05 70 1.50E-04 -7.84E-05 -1.87E-04 -1.87E-04 -3.56E-04 -1.04E-05 1.33E-05 -1.05E-04 -4.03E-04 1.28E-05 5.26E-05 7.53E-05 -1.02E-04 1.87E-04 4.12E-04 -6.16E-04 -1.31E-04 1.92E-04 3.95E-04 -6.57E-04 -1.22E-04 1.88E-04 3.93E-04 -6.36E-04 -1.21E-04 1.90E-04 4.00E-04 -6.42E-04 -1.20E-04 1.89E-04 3.99E-04 -6.38E-04 -1.20E-04 1.89E-04 3.98E-04 -6.37E-04 -1.32E-04 1.86E-04 3.79E-04 -6.42E-04 -7.71E-05 -8.45E-05 -7.74E-05 -7.17E-05 -6.25E-05 -6.31E-05 -9.85E-05 1.88E-04 1.87E-04 1.87E-04 1.90E-04 1.92E-04 1.91E-04 1.77E-04 4.39E-04 4.28E-04 4.36E-04 4.50E-04 4.63E-04 4.62E-04 3.87E-04 -5.93E-04 -5.97E-04 -5.90E-04 -5.93E-04 -5.88E-04 -5.88E-04 -5.84E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 15 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.5. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.5. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 4.41E-09 -3.04E-09 4.13E-09 -2.19E-09 -6.00E-11 1.17E-08 -7.99E-10 1.04E-09 2.53E-09 2.21E-09 5.71E-10 -7.15E-09 10 4.46E-09 -3.63E-09 3.75E-09 -2.65E-09 -1.27E-10 1.10E-08 -1.27E-09 1.20E-09 2.59E-09 1.90E-09 5.56E-10 -7.16E-09 20 4.53E-09 -3.35E-09 3.89E-09 -2.31E-09 -6.37E-10 1.10E-08 -1.72E-09 1.71E-09 3.13E-09 1.81E-09 5.74E-10 -6.93E-09 30 4.38E-09 -3.41E-09 3.80E-09 -2.20E-09 -7.42E-10 1.04E-08 -1.72E-09 2.05E-09 3.48E-09 1.59E-09 4.92E-10 -6.78E-09 50 4.07E-09 -3.29E-09 4.20E-09 -2.49E-09 -7.82E-10 9.99E-09 -2.13E-09 2.35E-09 3.68E-09 2.48E-09 5.36E-10 -6.75E-09 60 4.24E-09 -3.17E-09 4.28E-09 -2.46E-09 -5.93E-10 1.01E-08 -2.09E-09 2.11E-09 3.70E-09 2.07E-09 5.24E-10 -6.73E-09 70 4.45E-09 -3.62E-09 3.66E-09 -2.29E-09 -6.50E-11 1.04E-08 -1.16E-09 1.19E-09 3.15E-09 2.29E-09 5.17E-10 -6.72E-09 6.49E-10 3.48E-09 1.02E-08 -8.89E-09 3.62E-10 3.66E-09 1.04E-08 -9.67E-09 4.24E-10 3.60E-09 1.03E-08 -9.44E-09 3.65E-10 3.53E-09 1.01E-08 -9.32E-09 3.40E-10 3.58E-09 1.02E-08 -9.48E-09 4.60E-10 3.59E-09 1.03E-08 -9.40E-09 4.26E-10 3.56E-09 1.02E-08 -9.32E-09 3.33E-09 3.09E-09 3.18E-09 3.16E-09 3.27E-09 3.18E-09 3.18E-09 4.85E-09 4.67E-09 4.72E-09 4.48E-09 4.36E-09 4.44E-09 4.36E-09 1.66E-08 1.59E-08 1.61E-08 1.54E-08 1.52E-08 1.54E-08 1.51E-08 -9.96E-09 -9.71E-09 -9.75E-09 -9.12E-09 -8.67E-09 -8.99E-09 -8.77E-09 -7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 PASS PASS PASS PASS PASS PASS PASS 7.00E-08 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 17 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.6. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 18 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.6. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.90E-11 4.82E-09 -1.44E-09 1.58E-09 -1.35E-09 2.02E-09 -2.80E-09 4.92E-09 -9.12E-09 1.51E-09 2.05E-10 -7.45E-10 10 1.58E-10 5.08E-09 -1.64E-09 1.43E-09 -1.64E-09 1.87E-09 -3.48E-09 5.16E-09 -9.03E-09 1.92E-09 2.09E-10 -7.28E-10 20 -2.43E-10 5.19E-09 -1.95E-09 1.73E-09 -1.28E-09 2.56E-09 -3.10E-09 5.31E-09 -8.58E-09 3.04E-09 2.65E-10 -6.57E-10 30 3.33E-10 4.88E-09 -2.12E-09 1.60E-09 -1.70E-09 2.22E-09 -2.93E-09 4.78E-09 -8.46E-09 3.46E-09 1.56E-10 -6.59E-10 50 -9.24E-10 4.82E-09 -2.85E-09 1.94E-09 -1.72E-09 3.03E-09 -2.55E-09 5.62E-09 -8.15E-09 4.04E-09 1.96E-10 -7.51E-10 60 -8.09E-10 5.02E-09 -2.77E-09 1.74E-09 -1.67E-09 3.07E-09 -2.72E-09 5.30E-09 -8.57E-09 4.28E-09 1.90E-10 -8.02E-10 70 2.13E-10 5.08E-09 -2.24E-09 2.10E-09 -1.43E-09 2.29E-09 -2.45E-09 4.49E-09 -8.69E-09 2.99E-09 1.95E-10 -7.32E-10 7.28E-10 2.60E-09 7.85E-09 -6.40E-09 6.79E-10 2.78E-09 8.31E-09 -6.95E-09 6.87E-10 2.87E-09 8.57E-09 -7.20E-09 5.98E-10 2.83E-09 8.37E-09 -7.17E-09 2.52E-10 3.11E-09 8.77E-09 -8.27E-09 3.03E-10 3.12E-09 8.86E-09 -8.25E-09 7.44E-10 2.94E-09 8.80E-09 -7.31E-09 -6.94E-10 -7.14E-10 -1.54E-10 -1.85E-10 3.99E-10 2.70E-10 -2.74E-10 5.46E-09 5.59E-09 5.64E-09 5.47E-09 5.68E-09 5.84E-09 5.37E-09 1.43E-08 1.46E-08 1.53E-08 1.48E-08 1.60E-08 1.63E-08 1.45E-08 -1.57E-08 -1.60E-08 -1.56E-08 -1.52E-08 -1.52E-08 -1.57E-08 -1.50E-08 -7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 PASS PASS PASS PASS PASS PASS PASS 7.00E-08 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 19 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.7. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.7. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -2.54E-07 -2.29E-07 -2.31E-07 -2.69E-07 -2.71E-07 -2.19E-07 -2.52E-07 -2.66E-07 -2.42E-07 -2.61E-07 -2.32E-07 -2.42E-07 10 -2.57E-07 -2.33E-07 -2.35E-07 -2.74E-07 -2.76E-07 -2.29E-07 -2.63E-07 -2.77E-07 -2.52E-07 -2.74E-07 -2.31E-07 -2.42E-07 20 -2.61E-07 -2.36E-07 -2.37E-07 -2.77E-07 -2.79E-07 -2.34E-07 -2.68E-07 -2.83E-07 -2.55E-07 -2.80E-07 -2.30E-07 -2.40E-07 30 -2.62E-07 -2.37E-07 -2.38E-07 -2.78E-07 -2.81E-07 -2.39E-07 -2.72E-07 -2.89E-07 -2.62E-07 -2.86E-07 -2.28E-07 -2.39E-07 50 -2.68E-07 -2.42E-07 -2.41E-07 -2.85E-07 -2.87E-07 -2.49E-07 -2.83E-07 -3.02E-07 -2.72E-07 -2.99E-07 -2.28E-07 -2.39E-07 60 -2.68E-07 -2.43E-07 -2.41E-07 -2.85E-07 -2.87E-07 -2.48E-07 -2.82E-07 -3.01E-07 -2.71E-07 -2.98E-07 -2.28E-07 -2.38E-07 70 -2.63E-07 -2.38E-07 -2.37E-07 -2.79E-07 -2.81E-07 -2.32E-07 -2.65E-07 -2.80E-07 -2.54E-07 -2.76E-07 -2.28E-07 -2.38E-07 -2.51E-07 2.02E-08 -1.95E-07 -3.06E-07 -2.55E-07 2.06E-08 -1.99E-07 -3.12E-07 -2.58E-07 2.09E-08 -2.00E-07 -3.15E-07 -2.59E-07 2.11E-08 -2.01E-07 -3.17E-07 -2.65E-07 2.22E-08 -2.04E-07 -3.25E-07 -2.65E-07 2.21E-08 -2.04E-07 -3.25E-07 -2.59E-07 2.14E-08 -2.01E-07 -3.18E-07 -2.48E-07 -2.59E-07 -2.64E-07 -2.70E-07 -2.81E-07 -2.80E-07 -2.61E-07 1.87E-08 1.95E-08 2.01E-08 2.05E-08 2.15E-08 2.16E-08 1.94E-08 -1.96E-07 -2.06E-07 -2.09E-07 -2.13E-07 -2.22E-07 -2.21E-07 -2.08E-07 -2.99E-07 -3.12E-07 -3.19E-07 -3.26E-07 -3.40E-07 -3.39E-07 -3.15E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 21 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.8. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.8. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -2.52E-07 -2.14E-07 -2.28E-07 -2.68E-07 -2.70E-07 -2.15E-07 -2.54E-07 -2.68E-07 -2.52E-07 -2.59E-07 -2.40E-07 -2.38E-07 10 -2.56E-07 -2.18E-07 -2.32E-07 -2.72E-07 -2.75E-07 -2.25E-07 -2.64E-07 -2.81E-07 -2.62E-07 -2.72E-07 -2.39E-07 -2.37E-07 20 -2.60E-07 -2.21E-07 -2.34E-07 -2.75E-07 -2.78E-07 -2.30E-07 -2.69E-07 -2.89E-07 -2.65E-07 -2.77E-07 -2.37E-07 -2.36E-07 30 -2.61E-07 -2.22E-07 -2.35E-07 -2.76E-07 -2.80E-07 -2.34E-07 -2.73E-07 -2.96E-07 -2.71E-07 -2.83E-07 -2.36E-07 -2.35E-07 50 -2.67E-07 -2.28E-07 -2.39E-07 -2.82E-07 -2.87E-07 -2.44E-07 -2.84E-07 -3.13E-07 -2.81E-07 -2.95E-07 -2.36E-07 -2.35E-07 60 -2.67E-07 -2.28E-07 -2.39E-07 -2.82E-07 -2.87E-07 -2.43E-07 -2.83E-07 -3.12E-07 -2.81E-07 -2.93E-07 -2.36E-07 -2.34E-07 70 -2.61E-07 -2.23E-07 -2.35E-07 -2.77E-07 -2.80E-07 -2.27E-07 -2.66E-07 -2.86E-07 -2.64E-07 -2.73E-07 -2.36E-07 -2.34E-07 -2.46E-07 2.48E-08 -1.78E-07 -3.14E-07 -2.51E-07 2.51E-08 -1.82E-07 -3.19E-07 -2.53E-07 2.52E-08 -1.84E-07 -3.22E-07 -2.55E-07 2.54E-08 -1.85E-07 -3.24E-07 -2.61E-07 2.60E-08 -1.89E-07 -3.32E-07 -2.61E-07 2.61E-08 -1.89E-07 -3.32E-07 -2.55E-07 2.56E-08 -1.85E-07 -3.25E-07 -2.50E-07 -2.61E-07 -2.66E-07 -2.71E-07 -2.83E-07 -2.82E-07 -2.63E-07 2.03E-08 2.11E-08 2.21E-08 2.31E-08 2.55E-08 2.52E-08 2.19E-08 -1.94E-07 -2.03E-07 -2.06E-07 -2.08E-07 -2.14E-07 -2.13E-07 -2.03E-07 -3.05E-07 -3.19E-07 -3.26E-07 -3.35E-07 -3.53E-07 -3.51E-07 -3.24E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 23 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.9. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.9. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -2.58E-07 -2.25E-07 -2.35E-07 -2.66E-07 -2.71E-07 -2.30E-07 -2.51E-07 -2.67E-07 -2.44E-07 -2.63E-07 -2.32E-07 -2.35E-07 10 -2.62E-07 -2.29E-07 -2.38E-07 -2.71E-07 -2.76E-07 -2.40E-07 -2.61E-07 -2.78E-07 -2.54E-07 -2.76E-07 -2.32E-07 -2.34E-07 20 -2.65E-07 -2.32E-07 -2.40E-07 -2.74E-07 -2.78E-07 -2.45E-07 -2.66E-07 -2.85E-07 -2.58E-07 -2.82E-07 -2.30E-07 -2.33E-07 30 -2.66E-07 -2.33E-07 -2.41E-07 -2.75E-07 -2.80E-07 -2.49E-07 -2.70E-07 -2.90E-07 -2.65E-07 -2.88E-07 -2.29E-07 -2.32E-07 50 -2.72E-07 -2.39E-07 -2.45E-07 -2.82E-07 -2.86E-07 -2.59E-07 -2.81E-07 -3.04E-07 -2.76E-07 -3.01E-07 -2.29E-07 -2.32E-07 60 -2.72E-07 -2.39E-07 -2.45E-07 -2.81E-07 -2.86E-07 -2.58E-07 -2.80E-07 -3.03E-07 -2.74E-07 -3.00E-07 -2.29E-07 -2.31E-07 70 -2.67E-07 -2.34E-07 -2.41E-07 -2.76E-07 -2.81E-07 -2.42E-07 -2.63E-07 -2.81E-07 -2.57E-07 -2.78E-07 -2.28E-07 -2.31E-07 -2.51E-07 2.01E-08 -1.96E-07 -3.06E-07 -2.55E-07 2.05E-08 -1.99E-07 -3.11E-07 -2.58E-07 2.05E-08 -2.02E-07 -3.14E-07 -2.59E-07 2.08E-08 -2.02E-07 -3.16E-07 -2.65E-07 2.16E-08 -2.06E-07 -3.24E-07 -2.65E-07 2.14E-08 -2.06E-07 -3.24E-07 -2.60E-07 2.12E-08 -2.01E-07 -3.18E-07 -2.51E-07 -2.62E-07 -2.67E-07 -2.72E-07 -2.84E-07 -2.83E-07 -2.64E-07 1.47E-08 1.56E-08 1.66E-08 1.72E-08 1.87E-08 1.85E-08 1.60E-08 -2.10E-07 -2.19E-07 -2.22E-07 -2.25E-07 -2.33E-07 -2.32E-07 -2.20E-07 -2.91E-07 -3.05E-07 -3.13E-07 -3.20E-07 -3.35E-07 -3.34E-07 -3.08E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 25 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.10. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.10. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -2.52E-07 -2.19E-07 -2.26E-07 -2.69E-07 -2.68E-07 -2.17E-07 -2.51E-07 -2.72E-07 -2.42E-07 -2.61E-07 -2.40E-07 -2.37E-07 10 -2.56E-07 -2.23E-07 -2.30E-07 -2.74E-07 -2.73E-07 -2.27E-07 -2.61E-07 -2.86E-07 -2.52E-07 -2.73E-07 -2.39E-07 -2.37E-07 20 -2.59E-07 -2.26E-07 -2.32E-07 -2.76E-07 -2.76E-07 -2.32E-07 -2.66E-07 -2.94E-07 -2.56E-07 -2.80E-07 -2.37E-07 -2.35E-07 30 -2.61E-07 -2.27E-07 -2.33E-07 -2.77E-07 -2.78E-07 -2.36E-07 -2.70E-07 -3.00E-07 -2.62E-07 -2.86E-07 -2.36E-07 -2.34E-07 50 -2.66E-07 -2.32E-07 -2.36E-07 -2.84E-07 -2.85E-07 -2.47E-07 -2.81E-07 -3.18E-07 -2.73E-07 -2.99E-07 -2.36E-07 -2.34E-07 60 -2.66E-07 -2.32E-07 -2.36E-07 -2.84E-07 -2.85E-07 -2.46E-07 -2.80E-07 -3.17E-07 -2.72E-07 -2.97E-07 -2.36E-07 -2.33E-07 70 -2.61E-07 -2.27E-07 -2.32E-07 -2.79E-07 -2.78E-07 -2.29E-07 -2.63E-07 -2.90E-07 -2.55E-07 -2.76E-07 -2.36E-07 -2.33E-07 -2.47E-07 2.34E-08 -1.83E-07 -3.11E-07 -2.51E-07 2.38E-08 -1.86E-07 -3.16E-07 -2.54E-07 2.40E-08 -1.88E-07 -3.20E-07 -2.55E-07 2.43E-08 -1.89E-07 -3.22E-07 -2.61E-07 2.52E-08 -1.91E-07 -3.30E-07 -2.61E-07 2.51E-08 -1.92E-07 -3.30E-07 -2.56E-07 2.47E-08 -1.88E-07 -3.23E-07 -2.49E-07 -2.60E-07 -2.66E-07 -2.71E-07 -2.84E-07 -2.82E-07 -2.63E-07 2.11E-08 2.22E-08 2.34E-08 2.45E-08 2.70E-08 2.66E-08 2.30E-08 -1.91E-07 -1.99E-07 -2.01E-07 -2.04E-07 -2.09E-07 -2.09E-07 -2.00E-07 -3.06E-07 -3.21E-07 -3.30E-07 -3.38E-07 -3.58E-07 -3.55E-07 -3.26E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 27 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.11. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.11. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.80E-04 3.32E-04 1.00E-05 1.81E-04 -3.88E-05 -2.15E-05 7.53E-05 3.04E-04 2.09E-04 2.60E-04 1.55E-05 6.78E-05 10 1.63E-04 3.05E-04 -1.40E-05 1.53E-04 -7.25E-05 -3.18E-05 5.99E-05 2.89E-04 1.93E-04 2.60E-04 1.52E-05 6.82E-05 20 1.70E-04 3.16E-04 -1.17E-05 1.58E-04 -6.39E-05 -2.75E-05 6.25E-05 2.93E-04 1.98E-04 2.67E-04 1.70E-05 6.68E-05 30 1.76E-04 3.21E-04 -3.87E-06 1.61E-04 -6.04E-05 -2.32E-05 6.31E-05 2.97E-04 1.98E-04 2.72E-04 1.93E-05 6.77E-05 50 1.77E-04 3.25E-04 -3.51E-06 1.59E-04 -6.64E-05 -2.33E-05 6.48E-05 2.97E-04 1.99E-04 2.82E-04 2.12E-05 6.59E-05 60 1.76E-04 3.25E-04 -2.78E-06 1.60E-04 -6.57E-05 -2.30E-05 6.51E-05 2.96E-04 1.99E-04 2.81E-04 2.11E-05 6.53E-05 70 1.86E-04 3.22E-04 -5.01E-05 1.76E-04 -5.64E-05 -1.68E-05 7.86E-05 2.75E-04 1.90E-04 2.44E-04 2.00E-05 6.66E-05 1.33E-04 1.49E-04 5.41E-04 -2.75E-04 1.07E-04 1.51E-04 5.21E-04 -3.07E-04 1.14E-04 1.53E-04 5.33E-04 -3.05E-04 1.19E-04 1.53E-04 5.37E-04 -3.00E-04 1.18E-04 1.55E-04 5.44E-04 -3.08E-04 1.18E-04 1.55E-04 5.44E-04 -3.07E-04 1.16E-04 1.64E-04 5.67E-04 -3.36E-04 1.65E-04 1.54E-04 1.59E-04 1.61E-04 1.64E-04 1.64E-04 1.54E-04 1.35E-04 1.36E-04 1.37E-04 1.38E-04 1.39E-04 1.39E-04 1.21E-04 5.36E-04 5.27E-04 5.35E-04 5.39E-04 5.46E-04 5.44E-04 4.87E-04 -2.05E-04 -2.20E-04 -2.18E-04 -2.16E-04 -2.18E-04 -2.17E-04 -1.79E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 29 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.12. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 30 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.12. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.07E-04 1.53E-04 2.13E-04 -1.05E-04 -1.06E-04 2.73E-04 2.03E-04 3.96E-05 2.99E-05 2.91E-04 3.67E-04 2.21E-04 10 2.87E-04 1.34E-04 1.76E-04 -1.37E-04 -1.40E-04 2.65E-04 1.91E-04 4.24E-05 1.86E-05 2.90E-04 3.67E-04 2.21E-04 20 2.94E-04 1.43E-04 1.80E-04 -1.34E-04 -1.23E-04 2.68E-04 1.93E-04 6.63E-05 2.28E-05 2.96E-04 3.70E-04 2.31E-04 30 2.96E-04 1.47E-04 1.83E-04 -1.33E-04 -1.24E-04 2.72E-04 1.96E-04 9.36E-05 2.03E-05 2.99E-04 3.73E-04 2.33E-04 50 3.00E-04 1.48E-04 1.79E-04 -1.31E-04 -1.24E-04 2.76E-04 1.95E-04 1.35E-04 2.40E-05 3.05E-04 3.72E-04 2.24E-04 60 3.00E-04 1.47E-04 1.79E-04 -1.31E-04 -1.24E-04 2.76E-04 1.96E-04 1.31E-04 2.46E-05 3.04E-04 3.72E-04 2.24E-04 70 3.01E-04 1.55E-04 1.37E-04 -1.30E-04 -1.08E-04 2.61E-04 2.08E-04 4.09E-05 2.41E-05 2.80E-04 3.73E-04 2.24E-04 9.22E-05 1.89E-04 6.10E-04 -4.26E-04 6.38E-05 1.93E-04 5.93E-04 -4.65E-04 7.19E-05 1.91E-04 5.97E-04 -4.53E-04 7.40E-05 1.93E-04 6.03E-04 -4.55E-04 7.43E-05 1.93E-04 6.03E-04 -4.54E-04 7.41E-05 1.93E-04 6.03E-04 -4.55E-04 7.10E-05 1.85E-04 5.78E-04 -4.36E-04 1.67E-04 1.61E-04 1.69E-04 1.76E-04 1.87E-04 1.86E-04 1.63E-04 1.26E-04 1.25E-04 1.21E-04 1.18E-04 1.13E-04 1.13E-04 1.22E-04 5.12E-04 5.05E-04 5.01E-04 5.00E-04 4.97E-04 4.97E-04 4.97E-04 -1.77E-04 -1.82E-04 -1.62E-04 -1.48E-04 -1.23E-04 -1.24E-04 -1.72E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 31 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.13. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.13. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.96E-09 7.79E-10 -3.38E-09 -5.15E-09 1.63E-09 3.80E-11 5.02E-09 -8.12E-09 -1.98E-09 1.19E-08 -2.62E-09 8.52E-09 10 4.46E-09 1.78E-09 -2.89E-09 -4.19E-09 3.83E-10 -1.17E-09 5.27E-09 -7.09E-09 -2.23E-09 1.80E-08 -2.61E-09 8.54E-09 20 3.21E-09 1.58E-09 -4.36E-09 -5.26E-09 -1.15E-09 -1.66E-09 6.23E-09 -6.29E-09 -1.43E-09 1.70E-08 -2.55E-09 8.40E-09 30 3.14E-09 1.12E-09 -3.80E-09 -5.68E-09 -1.41E-09 -8.38E-10 6.67E-09 -7.56E-09 -1.49E-09 1.69E-08 -2.59E-09 8.30E-09 50 2.55E-09 -4.09E-10 -5.48E-09 -8.32E-09 -3.85E-09 -1.77E-09 6.21E-09 -8.81E-09 -6.29E-10 1.65E-08 -2.62E-09 8.33E-09 60 2.60E-09 1.76E-10 -4.91E-09 -7.88E-09 -3.24E-09 -1.59E-09 5.67E-09 -8.30E-09 -1.14E-09 1.64E-08 -2.58E-09 8.27E-09 70 1.46E-08 1.34E-08 7.46E-09 6.81E-09 1.56E-08 -6.06E-10 5.69E-09 -9.59E-09 -1.15E-09 1.36E-08 -2.50E-09 8.28E-09 -6.33E-10 3.46E-09 8.86E-09 -1.01E-08 -9.22E-11 3.50E-09 9.52E-09 -9.70E-09 -1.20E-09 3.66E-09 8.84E-09 -1.12E-08 -1.32E-09 3.57E-09 8.47E-09 -1.11E-08 -3.10E-09 4.26E-09 8.58E-09 -1.48E-08 -2.65E-09 4.13E-09 8.68E-09 -1.40E-08 1.16E-08 4.12E-09 2.29E-08 2.56E-10 1.37E-09 2.55E-09 2.78E-09 2.74E-09 2.30E-09 2.20E-09 1.58E-09 7.53E-09 9.68E-09 9.15E-09 9.39E-09 9.56E-09 9.33E-09 8.62E-09 2.20E-08 2.91E-08 2.79E-08 2.85E-08 2.85E-08 2.78E-08 2.52E-08 -1.93E-08 -2.40E-08 -2.23E-08 -2.30E-08 -2.39E-08 -2.34E-08 -2.21E-08 -7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 PASS PASS PASS PASS PASS PASS PASS 7.00E-08 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 33 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.14. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 34 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.14. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 9.17E-09 3.73E-09 8.93E-09 2.39E-09 -5.31E-09 6.33E-09 1.11E-08 -1.59E-09 8.35E-09 -1.70E-11 2.40E-09 8.30E-11 10 9.70E-09 4.25E-09 8.35E-09 3.55E-09 -5.55E-09 6.59E-09 1.16E-08 6.60E-10 8.74E-09 2.49E-09 2.21E-09 4.70E-11 20 9.29E-09 4.04E-09 8.39E-09 2.69E-09 -7.03E-09 7.21E-09 1.16E-08 2.76E-09 7.67E-09 2.51E-09 2.32E-09 1.70E-10 30 8.17E-09 3.19E-09 8.55E-09 2.72E-09 -6.65E-09 7.88E-09 1.10E-08 4.75E-09 7.54E-09 1.18E-09 2.27E-09 1.32E-10 50 6.88E-09 1.83E-09 5.81E-09 1.74E-09 -8.34E-09 7.81E-09 1.14E-08 7.05E-09 7.82E-09 3.83E-10 2.33E-09 3.90E-11 60 7.84E-09 1.94E-09 7.06E-09 1.85E-09 -8.68E-09 8.02E-09 1.23E-08 6.66E-09 7.39E-09 3.88E-10 2.28E-09 2.30E-11 70 1.87E-08 1.68E-08 1.97E-08 1.33E-08 1.03E-08 6.37E-09 1.11E-08 3.43E-10 8.57E-09 1.55E-09 2.32E-09 9.90E-11 3.78E-09 5.92E-09 2.00E-08 -1.24E-08 4.06E-09 5.97E-09 2.04E-08 -1.23E-08 3.48E-09 6.50E-09 2.13E-08 -1.44E-08 3.20E-09 6.13E-09 2.00E-08 -1.36E-08 1.58E-09 6.01E-09 1.81E-08 -1.49E-08 2.00E-09 6.59E-09 2.01E-08 -1.61E-08 1.57E-08 3.88E-09 2.64E-08 5.09E-09 4.84E-09 6.02E-09 6.35E-09 6.46E-09 6.89E-09 6.96E-09 5.58E-09 5.45E-09 4.48E-09 3.80E-09 3.68E-09 4.00E-09 4.28E-09 4.57E-09 1.98E-08 1.83E-08 1.68E-08 1.66E-08 1.79E-08 1.87E-08 1.81E-08 -1.01E-08 -6.27E-09 -4.08E-09 -3.63E-09 -4.09E-09 -4.79E-09 -6.96E-09 -7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 PASS PASS PASS PASS PASS PASS PASS 7.00E-08 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 35 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.15. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.15. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.25E-07 2.96E-07 2.87E-07 3.16E-07 3.24E-07 2.80E-07 3.23E-07 3.13E-07 3.02E-07 3.22E-07 2.96E-07 2.94E-07 10 3.46E-07 3.20E-07 3.08E-07 3.37E-07 3.47E-07 3.14E-07 3.53E-07 3.55E-07 3.34E-07 3.68E-07 2.96E-07 2.93E-07 20 3.58E-07 3.38E-07 3.22E-07 3.49E-07 3.67E-07 3.38E-07 3.75E-07 3.89E-07 3.54E-07 3.98E-07 2.94E-07 2.92E-07 30 3.72E-07 3.50E-07 3.35E-07 3.63E-07 3.83E-07 3.54E-07 3.91E-07 4.13E-07 3.72E-07 4.21E-07 2.94E-07 2.92E-07 50 3.98E-07 3.77E-07 3.55E-07 3.89E-07 4.10E-07 3.86E-07 4.25E-07 4.58E-07 4.04E-07 4.63E-07 2.94E-07 2.92E-07 60 3.96E-07 3.74E-07 3.53E-07 3.89E-07 4.10E-07 3.83E-07 4.21E-07 4.54E-07 3.99E-07 4.59E-07 2.94E-07 2.91E-07 70 3.80E-07 3.58E-07 3.39E-07 3.73E-07 3.90E-07 3.39E-07 3.77E-07 3.81E-07 3.57E-07 3.91E-07 2.94E-07 2.91E-07 3.10E-07 1.72E-08 3.57E-07 2.63E-07 3.32E-07 1.71E-08 3.79E-07 2.85E-07 3.47E-07 1.75E-08 3.95E-07 2.99E-07 3.61E-07 1.88E-08 4.12E-07 3.09E-07 3.86E-07 2.10E-08 4.43E-07 3.28E-07 3.84E-07 2.17E-08 4.44E-07 3.25E-07 3.68E-07 2.00E-08 4.23E-07 3.13E-07 3.08E-07 3.45E-07 3.71E-07 3.90E-07 4.27E-07 4.23E-07 3.69E-07 1.77E-08 2.12E-08 2.48E-08 2.78E-08 3.35E-08 3.34E-08 2.08E-08 3.56E-07 4.03E-07 4.39E-07 4.67E-07 5.19E-07 5.15E-07 4.26E-07 2.59E-07 2.87E-07 3.03E-07 3.14E-07 3.35E-07 3.32E-07 3.12E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 37 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.16. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.16. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.24E-07 2.91E-07 2.85E-07 3.25E-07 3.19E-07 2.85E-07 3.16E-07 3.32E-07 3.10E-07 3.09E-07 2.99E-07 2.85E-07 10 3.42E-07 3.15E-07 3.05E-07 3.44E-07 3.44E-07 3.21E-07 3.47E-07 3.84E-07 3.40E-07 3.51E-07 2.98E-07 2.85E-07 20 3.57E-07 3.33E-07 3.20E-07 3.59E-07 3.62E-07 3.41E-07 3.68E-07 4.27E-07 3.62E-07 3.82E-07 2.97E-07 2.84E-07 30 3.69E-07 3.44E-07 3.31E-07 3.73E-07 3.78E-07 3.59E-07 3.86E-07 4.62E-07 3.79E-07 4.04E-07 2.96E-07 2.83E-07 50 3.93E-07 3.71E-07 3.53E-07 3.98E-07 4.08E-07 3.92E-07 4.19E-07 5.27E-07 4.12E-07 4.42E-07 2.96E-07 2.83E-07 60 3.92E-07 3.70E-07 3.52E-07 3.97E-07 4.06E-07 3.89E-07 4.16E-07 5.22E-07 4.09E-07 4.40E-07 2.96E-07 2.83E-07 70 3.77E-07 3.55E-07 3.37E-07 3.80E-07 3.88E-07 3.43E-07 3.71E-07 4.20E-07 3.65E-07 3.76E-07 2.96E-07 2.83E-07 3.09E-07 1.94E-08 3.62E-07 2.56E-07 3.30E-07 1.85E-08 3.80E-07 2.79E-07 3.46E-07 1.85E-08 3.97E-07 2.95E-07 3.59E-07 2.03E-08 4.15E-07 3.03E-07 3.85E-07 2.22E-08 4.46E-07 3.24E-07 3.84E-07 2.19E-08 4.44E-07 3.23E-07 3.67E-07 2.10E-08 4.25E-07 3.10E-07 3.11E-07 3.49E-07 3.76E-07 3.98E-07 4.38E-07 4.35E-07 3.75E-07 1.67E-08 2.32E-08 3.22E-08 3.91E-08 5.27E-08 5.17E-08 2.81E-08 3.56E-07 4.12E-07 4.64E-07 5.05E-07 5.83E-07 5.77E-07 4.52E-07 2.65E-07 2.85E-07 2.88E-07 2.91E-07 2.94E-07 2.93E-07 2.98E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 39 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.17. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.17. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.22E-07 2.94E-07 2.90E-07 3.21E-07 3.22E-07 2.79E-07 3.17E-07 3.20E-07 3.03E-07 3.10E-07 2.98E-07 2.85E-07 10 3.40E-07 3.18E-07 3.11E-07 3.41E-07 3.45E-07 3.14E-07 3.47E-07 3.61E-07 3.36E-07 3.49E-07 2.98E-07 2.85E-07 20 3.53E-07 3.36E-07 3.27E-07 3.54E-07 3.67E-07 3.39E-07 3.67E-07 3.92E-07 3.55E-07 3.79E-07 2.97E-07 2.84E-07 30 3.68E-07 3.48E-07 3.38E-07 3.68E-07 3.83E-07 3.54E-07 3.85E-07 4.18E-07 3.71E-07 4.04E-07 2.96E-07 2.83E-07 50 3.93E-07 3.78E-07 3.60E-07 3.96E-07 4.13E-07 3.86E-07 4.16E-07 4.67E-07 4.03E-07 4.47E-07 2.96E-07 2.83E-07 60 3.91E-07 3.74E-07 3.57E-07 3.94E-07 4.12E-07 3.84E-07 4.15E-07 4.63E-07 4.02E-07 4.43E-07 2.96E-07 2.83E-07 70 3.65E-07 3.45E-07 3.31E-07 3.66E-07 3.72E-07 3.40E-07 3.70E-07 3.90E-07 3.57E-07 3.76E-07 2.96E-07 2.83E-07 3.10E-07 1.61E-08 3.54E-07 2.66E-07 3.31E-07 1.55E-08 3.73E-07 2.89E-07 3.47E-07 1.57E-08 3.90E-07 3.04E-07 3.61E-07 1.79E-08 4.10E-07 3.12E-07 3.88E-07 2.01E-08 4.43E-07 3.33E-07 3.86E-07 2.12E-08 4.44E-07 3.28E-07 3.56E-07 1.71E-08 4.03E-07 3.09E-07 3.06E-07 3.42E-07 3.67E-07 3.86E-07 4.24E-07 4.21E-07 3.67E-07 1.63E-08 1.76E-08 2.05E-08 2.58E-08 3.28E-08 3.16E-08 1.91E-08 3.51E-07 3.90E-07 4.23E-07 4.57E-07 5.14E-07 5.08E-07 4.19E-07 2.61E-07 2.93E-07 3.10E-07 3.16E-07 3.34E-07 3.35E-07 3.14E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 41 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.18. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.18. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.15E-07 2.87E-07 2.75E-07 3.22E-07 3.24E-07 2.79E-07 3.05E-07 3.33E-07 3.02E-07 3.09E-07 2.96E-07 2.84E-07 10 3.34E-07 3.10E-07 2.96E-07 3.41E-07 3.48E-07 3.14E-07 3.37E-07 3.81E-07 3.34E-07 3.47E-07 2.95E-07 2.84E-07 20 3.46E-07 3.29E-07 3.12E-07 3.56E-07 3.69E-07 3.37E-07 3.56E-07 4.22E-07 3.54E-07 3.76E-07 2.94E-07 2.83E-07 30 3.60E-07 3.40E-07 3.24E-07 3.71E-07 3.84E-07 3.51E-07 3.73E-07 4.57E-07 3.72E-07 4.02E-07 2.94E-07 2.83E-07 50 3.87E-07 3.70E-07 3.47E-07 3.98E-07 4.16E-07 3.83E-07 4.06E-07 5.20E-07 4.04E-07 4.43E-07 2.93E-07 2.83E-07 60 3.85E-07 3.68E-07 3.45E-07 3.96E-07 4.14E-07 3.82E-07 4.03E-07 5.14E-07 4.02E-07 4.38E-07 2.94E-07 2.83E-07 70 3.57E-07 3.41E-07 3.17E-07 3.68E-07 3.76E-07 3.39E-07 3.58E-07 4.18E-07 3.56E-07 3.75E-07 2.93E-07 2.83E-07 3.05E-07 2.21E-08 3.65E-07 2.44E-07 3.26E-07 2.16E-08 3.85E-07 2.67E-07 3.42E-07 2.22E-08 4.03E-07 2.82E-07 3.56E-07 2.42E-08 4.22E-07 2.89E-07 3.84E-07 2.66E-08 4.57E-07 3.11E-07 3.81E-07 2.65E-08 4.54E-07 3.09E-07 3.52E-07 2.34E-08 4.16E-07 2.88E-07 3.05E-07 3.43E-07 3.69E-07 3.91E-07 4.31E-07 4.28E-07 3.69E-07 1.91E-08 2.48E-08 3.25E-08 4.11E-08 5.41E-08 5.21E-08 3.04E-08 3.58E-07 4.11E-07 4.58E-07 5.04E-07 5.80E-07 5.70E-07 4.52E-07 2.53E-07 2.75E-07 2.80E-07 2.78E-07 2.83E-07 2.85E-07 2.86E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 43 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.19. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.19. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 4.00E-05 2.50E-04 -5.91E-05 2.89E-06 -1.86E-04 -1.62E-04 2.63E-05 3.94E-05 4.97E-05 1.54E-04 -6.90E-05 -2.49E-04 10 2.34E-05 2.16E-04 -8.01E-05 -2.71E-05 -2.11E-04 -1.70E-04 8.08E-06 2.22E-05 3.57E-05 1.43E-04 -6.99E-05 -2.47E-04 20 3.39E-05 2.29E-04 -7.45E-05 -1.87E-05 -2.00E-04 -1.68E-04 9.41E-06 2.39E-05 4.14E-05 1.52E-04 -6.94E-05 -2.49E-04 30 3.88E-05 2.32E-04 -6.11E-05 -1.39E-05 -1.95E-04 -1.64E-04 9.89E-06 2.79E-05 4.10E-05 1.54E-04 -6.58E-05 -2.48E-04 50 4.08E-05 2.34E-04 -5.69E-05 -1.51E-05 -2.04E-04 -1.65E-04 7.72E-06 2.56E-05 3.97E-05 1.61E-04 -6.53E-05 -2.52E-04 60 4.00E-05 2.35E-04 -5.78E-05 -1.33E-05 -2.03E-04 -1.64E-04 9.53E-06 2.52E-05 4.03E-05 1.60E-04 -6.40E-05 -2.54E-04 70 6.37E-05 2.15E-04 -8.69E-05 -2.23E-05 -1.97E-04 -1.59E-04 1.63E-05 1.44E-06 2.76E-05 1.28E-04 -6.61E-05 -2.51E-04 9.55E-06 1.59E-04 4.46E-04 -4.27E-04 -1.57E-05 1.56E-04 4.13E-04 -4.44E-04 -6.19E-06 1.57E-04 4.26E-04 -4.38E-04 6.40E-08 1.56E-04 4.28E-04 -4.28E-04 -2.00E-07 1.60E-04 4.37E-04 -4.38E-04 1.38E-07 1.59E-04 4.37E-04 -4.37E-04 -5.47E-06 1.56E-04 4.22E-04 -4.33E-04 2.16E-05 7.84E-06 1.17E-05 1.38E-05 1.37E-05 1.43E-05 2.91E-06 1.14E-04 1.13E-04 1.15E-04 1.14E-04 1.17E-04 1.16E-04 1.03E-04 3.35E-04 3.17E-04 3.27E-04 3.27E-04 3.33E-04 3.33E-04 2.86E-04 -2.92E-04 -3.02E-04 -3.03E-04 -2.99E-04 -3.06E-04 -3.04E-04 -2.81E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 45 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.20. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.20. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.87E-04 -1.80E-04 -4.53E-05 -1.71E-04 -3.40E-04 5.46E-05 3.81E-05 -2.24E-04 -2.24E-04 9.51E-05 8.56E-06 1.70E-04 10 1.64E-04 -1.99E-04 -8.68E-05 -2.00E-04 -3.74E-04 4.33E-05 2.19E-05 -2.19E-04 -2.34E-04 8.33E-05 6.51E-06 1.71E-04 20 1.71E-04 -1.94E-04 -8.44E-05 -1.94E-04 -3.51E-04 4.61E-05 2.60E-05 -1.91E-04 -2.30E-04 8.84E-05 1.01E-05 1.82E-04 30 1.75E-04 -1.90E-04 -8.21E-05 -1.92E-04 -3.54E-04 4.50E-05 2.60E-05 -1.63E-04 -2.34E-04 9.04E-05 1.05E-05 1.84E-04 50 1.74E-04 -1.89E-04 -8.72E-05 -1.86E-04 -3.52E-04 4.64E-05 2.39E-05 -1.17E-04 -2.32E-04 9.13E-05 9.89E-06 1.75E-04 60 1.73E-04 -1.90E-04 -8.74E-05 -1.88E-04 -3.53E-04 4.73E-05 2.29E-05 -1.22E-04 -2.30E-04 9.30E-05 9.05E-06 1.77E-04 70 1.60E-04 -2.06E-04 -1.20E-04 -1.69E-04 -3.63E-04 2.08E-05 1.55E-05 -2.22E-04 -2.30E-04 5.11E-05 9.41E-06 1.75E-04 -1.10E-04 1.96E-04 4.27E-04 -6.47E-04 -1.39E-04 1.98E-04 4.05E-04 -6.83E-04 -1.30E-04 1.93E-04 4.00E-04 -6.60E-04 -1.28E-04 1.95E-04 4.07E-04 -6.64E-04 -1.28E-04 1.94E-04 4.03E-04 -6.60E-04 -1.29E-04 1.94E-04 4.02E-04 -6.60E-04 -1.40E-04 1.91E-04 3.83E-04 -6.62E-04 -5.20E-05 -6.09E-05 -5.21E-05 -4.71E-05 -3.76E-05 -3.77E-05 -7.30E-05 1.58E-04 1.53E-04 1.47E-04 1.42E-04 1.34E-04 1.34E-04 1.40E-04 3.82E-04 3.58E-04 3.51E-04 3.43E-04 3.29E-04 3.30E-04 3.12E-04 -4.86E-04 -4.80E-04 -4.55E-04 -4.38E-04 -4.04E-04 -4.05E-04 -4.58E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 47 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.21. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.21. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 5.88E-09 -2.78E-09 5.05E-09 -2.02E-09 3.97E-10 1.25E-08 -2.99E-10 1.42E-09 2.76E-09 2.52E-09 8.06E-10 -7.89E-09 10 5.94E-09 -3.50E-09 4.59E-09 -2.50E-09 3.54E-10 1.21E-08 -9.79E-10 1.44E-09 3.03E-09 2.01E-09 7.26E-10 -7.81E-09 20 5.96E-09 -3.13E-09 4.83E-09 -2.09E-09 -2.47E-10 1.18E-08 -1.44E-09 2.31E-09 3.42E-09 1.93E-09 7.92E-10 -7.65E-09 30 5.78E-09 -3.24E-09 4.68E-09 -2.09E-09 -4.44E-10 1.10E-08 -2.16E-09 2.32E-09 3.78E-09 1.85E-09 7.30E-10 -7.49E-09 50 5.44E-09 -2.99E-09 5.09E-09 -2.47E-09 -6.71E-10 1.07E-08 -2.39E-09 2.78E-09 4.17E-09 2.70E-09 7.18E-10 -7.48E-09 60 5.66E-09 -2.94E-09 5.15E-09 -2.74E-09 -1.85E-10 1.08E-08 -1.95E-09 2.79E-09 4.17E-09 2.37E-09 7.32E-10 -7.39E-09 70 5.91E-09 -3.32E-09 4.62E-09 -2.08E-09 4.20E-10 1.11E-08 -8.38E-10 1.67E-09 3.53E-09 2.52E-09 7.15E-10 -7.37E-09 1.30E-09 3.98E-09 1.22E-08 -9.62E-09 9.77E-10 4.19E-09 1.25E-08 -1.05E-08 1.06E-09 4.11E-09 1.23E-08 -1.02E-08 9.39E-10 4.06E-09 1.21E-08 -1.02E-08 8.80E-10 4.10E-09 1.21E-08 -1.03E-08 9.89E-10 4.18E-09 1.24E-08 -1.05E-08 1.11E-09 4.05E-09 1.22E-08 -1.00E-08 3.78E-09 3.52E-09 3.59E-09 3.35E-09 3.59E-09 3.64E-09 3.59E-09 5.01E-09 5.01E-09 4.91E-09 4.79E-09 4.69E-09 4.61E-09 4.49E-09 1.75E-08 1.73E-08 1.71E-08 1.65E-08 1.64E-08 1.63E-08 1.59E-08 -9.97E-09 -1.02E-08 -9.86E-09 -9.79E-09 -9.27E-09 -9.02E-09 -8.72E-09 -7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 PASS PASS PASS PASS PASS PASS PASS 7.00E-08 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 49 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.22. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 50 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.22. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.85E-10 5.16E-09 -1.11E-09 2.38E-09 -1.66E-09 2.94E-09 -3.45E-09 4.89E-09 -9.06E-09 2.53E-09 -1.39E-10 9.80E-11 10 2.67E-10 5.43E-09 -1.41E-09 2.21E-09 -1.99E-09 2.71E-09 -4.12E-09 5.03E-09 -8.96E-09 3.71E-09 -1.16E-10 1.23E-10 20 -1.80E-10 5.54E-09 -1.71E-09 2.46E-09 -1.54E-09 3.51E-09 -3.75E-09 5.19E-09 -8.53E-09 4.52E-09 -6.20E-11 2.66E-10 30 4.75E-10 5.11E-09 -2.00E-09 2.40E-09 -2.06E-09 3.22E-09 -3.30E-09 4.40E-09 -8.04E-09 4.94E-09 -1.86E-10 2.18E-10 50 -9.93E-10 4.96E-09 -2.82E-09 2.67E-09 -2.19E-09 4.13E-09 -3.30E-09 5.46E-09 -7.97E-09 5.46E-09 -1.14E-10 1.52E-10 60 -8.91E-10 5.14E-09 -2.64E-09 2.49E-09 -2.16E-09 4.09E-09 -3.28E-09 5.00E-09 -8.17E-09 5.84E-09 -1.49E-10 5.10E-11 70 4.09E-10 5.29E-09 -1.97E-09 2.90E-09 -1.67E-09 3.28E-09 -2.96E-09 4.17E-09 -8.54E-09 4.35E-09 -1.59E-10 1.46E-10 9.91E-10 2.80E-09 8.68E-09 -6.69E-09 9.00E-10 3.01E-09 9.16E-09 -7.36E-09 9.17E-10 3.08E-09 9.35E-09 -7.52E-09 7.85E-10 3.05E-09 9.15E-09 -7.58E-09 3.26E-10 3.35E-09 9.51E-09 -8.86E-09 3.89E-10 3.33E-09 9.51E-09 -8.73E-09 9.92E-10 3.09E-09 9.47E-09 -7.49E-09 -4.29E-10 -3.26E-10 1.91E-10 2.43E-10 7.59E-10 6.95E-10 5.98E-11 5.74E-09 5.98E-09 6.05E-09 5.68E-09 6.09E-09 6.14E-09 5.67E-09 1.53E-08 1.61E-08 1.68E-08 1.58E-08 1.75E-08 1.75E-08 1.56E-08 -1.62E-08 -1.67E-08 -1.64E-08 -1.53E-08 -1.59E-08 -1.61E-08 -1.55E-08 -7.00E-08 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 -1.00E-07 PASS PASS PASS PASS PASS PASS PASS 7.00E-08 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 1.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 51 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.23. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 52 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.23. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.17E-07 -2.99E-07 -2.90E-07 -3.40E-07 -3.33E-07 -2.76E-07 -3.16E-07 -3.32E-07 -3.08E-07 -3.23E-07 -2.93E-07 -3.02E-07 10 -3.21E-07 -3.04E-07 -2.95E-07 -3.49E-07 -3.38E-07 -2.89E-07 -3.29E-07 -3.47E-07 -3.20E-07 -3.38E-07 -2.92E-07 -3.02E-07 20 -3.25E-07 -3.08E-07 -2.97E-07 -3.53E-07 -3.44E-07 -2.95E-07 -3.35E-07 -3.56E-07 -3.25E-07 -3.49E-07 -2.90E-07 -3.00E-07 30 -3.27E-07 -3.08E-07 -2.99E-07 -3.53E-07 -3.46E-07 -3.00E-07 -3.44E-07 -3.63E-07 -3.32E-07 -3.56E-07 -2.89E-07 -2.98E-07 50 -3.34E-07 -3.15E-07 -3.03E-07 -3.61E-07 -3.54E-07 -3.13E-07 -3.58E-07 -3.78E-07 -3.46E-07 -3.71E-07 -2.89E-07 -2.98E-07 60 -3.34E-07 -3.15E-07 -3.03E-07 -3.61E-07 -3.55E-07 -3.12E-07 -3.56E-07 -3.77E-07 -3.47E-07 -3.71E-07 -2.88E-07 -2.98E-07 70 -3.27E-07 -3.09E-07 -2.98E-07 -3.54E-07 -3.46E-07 -2.92E-07 -3.32E-07 -3.53E-07 -3.23E-07 -3.43E-07 -2.88E-07 -2.97E-07 -3.16E-07 2.16E-08 -2.57E-07 -3.75E-07 -3.21E-07 2.24E-08 -2.60E-07 -3.83E-07 -3.25E-07 2.35E-08 -2.61E-07 -3.90E-07 -3.27E-07 2.35E-08 -2.62E-07 -3.91E-07 -3.34E-07 2.47E-08 -2.66E-07 -4.01E-07 -3.34E-07 2.48E-08 -2.66E-07 -4.02E-07 -3.27E-07 2.37E-08 -2.62E-07 -3.92E-07 -3.11E-07 -3.25E-07 -3.32E-07 -3.39E-07 -3.53E-07 -3.53E-07 -3.29E-07 2.16E-08 2.25E-08 2.39E-08 2.47E-08 2.57E-08 2.58E-08 2.33E-08 -2.52E-07 -2.63E-07 -2.67E-07 -2.71E-07 -2.83E-07 -2.82E-07 -2.65E-07 -3.70E-07 -3.86E-07 -3.98E-07 -4.07E-07 -4.24E-07 -4.23E-07 -3.92E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 53 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.24. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 54 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.24. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.16E-07 -2.89E-07 -2.87E-07 -3.39E-07 -3.32E-07 -2.73E-07 -3.18E-07 -3.37E-07 -3.17E-07 -3.20E-07 -3.03E-07 -2.97E-07 10 -3.20E-07 -2.95E-07 -2.92E-07 -3.45E-07 -3.38E-07 -2.85E-07 -3.30E-07 -3.53E-07 -3.29E-07 -3.34E-07 -3.02E-07 -2.97E-07 20 -3.25E-07 -2.98E-07 -2.94E-07 -3.50E-07 -3.41E-07 -2.91E-07 -3.36E-07 -3.64E-07 -3.34E-07 -3.45E-07 -3.00E-07 -2.95E-07 30 -3.26E-07 -3.00E-07 -2.96E-07 -3.51E-07 -3.46E-07 -2.96E-07 -3.44E-07 -3.74E-07 -3.41E-07 -3.51E-07 -2.98E-07 -2.93E-07 50 -3.34E-07 -3.07E-07 -3.01E-07 -3.59E-07 -3.53E-07 -3.08E-07 -3.57E-07 -3.95E-07 -3.55E-07 -3.65E-07 -2.98E-07 -2.93E-07 60 -3.34E-07 -3.07E-07 -3.01E-07 -3.58E-07 -3.54E-07 -3.07E-07 -3.55E-07 -3.94E-07 -3.54E-07 -3.63E-07 -2.98E-07 -2.93E-07 70 -3.27E-07 -3.00E-07 -2.95E-07 -3.52E-07 -3.45E-07 -2.88E-07 -3.33E-07 -3.63E-07 -3.32E-07 -3.36E-07 -2.97E-07 -2.93E-07 -3.13E-07 2.39E-08 -2.47E-07 -3.78E-07 -3.18E-07 2.43E-08 -2.51E-07 -3.85E-07 -3.22E-07 2.49E-08 -2.53E-07 -3.90E-07 -3.24E-07 2.55E-08 -2.54E-07 -3.94E-07 -3.31E-07 2.62E-08 -2.59E-07 -4.03E-07 -3.31E-07 2.64E-08 -2.59E-07 -4.03E-07 -3.24E-07 2.56E-08 -2.54E-07 -3.94E-07 -3.13E-07 -3.27E-07 -3.34E-07 -3.41E-07 -3.56E-07 -3.54E-07 -3.30E-07 2.41E-08 2.51E-08 2.66E-08 2.85E-08 3.16E-08 3.12E-08 2.68E-08 -2.47E-07 -2.58E-07 -2.61E-07 -2.63E-07 -2.70E-07 -2.69E-07 -2.57E-07 -3.79E-07 -3.95E-07 -4.07E-07 -4.19E-07 -4.43E-07 -4.40E-07 -4.04E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 55 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.25. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 56 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.25. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.23E-07 -2.95E-07 -2.95E-07 -3.38E-07 -3.33E-07 -2.88E-07 -3.16E-07 -3.34E-07 -3.11E-07 -3.25E-07 -2.93E-07 -2.94E-07 10 -3.27E-07 -3.00E-07 -3.00E-07 -3.46E-07 -3.39E-07 -3.01E-07 -3.28E-07 -3.49E-07 -3.23E-07 -3.40E-07 -2.92E-07 -2.94E-07 20 -3.31E-07 -3.04E-07 -3.02E-07 -3.49E-07 -3.47E-07 -3.07E-07 -3.34E-07 -3.59E-07 -3.28E-07 -3.51E-07 -2.91E-07 -2.92E-07 30 -3.32E-07 -3.05E-07 -3.03E-07 -3.52E-07 -3.46E-07 -3.11E-07 -3.39E-07 -3.64E-07 -3.36E-07 -3.58E-07 -2.89E-07 -2.91E-07 50 -3.40E-07 -3.12E-07 -3.08E-07 -3.59E-07 -3.53E-07 -3.23E-07 -3.55E-07 -3.81E-07 -3.51E-07 -3.74E-07 -2.89E-07 -2.91E-07 60 -3.40E-07 -3.12E-07 -3.08E-07 -3.60E-07 -3.56E-07 -3.22E-07 -3.54E-07 -3.79E-07 -3.51E-07 -3.72E-07 -2.89E-07 -2.90E-07 70 -3.33E-07 -3.06E-07 -3.02E-07 -3.51E-07 -3.47E-07 -3.03E-07 -3.31E-07 -3.55E-07 -3.26E-07 -3.46E-07 -2.89E-07 -2.90E-07 -3.17E-07 2.05E-08 -2.61E-07 -3.73E-07 -3.22E-07 2.13E-08 -2.64E-07 -3.81E-07 -3.27E-07 2.27E-08 -2.64E-07 -3.89E-07 -3.28E-07 2.28E-08 -2.65E-07 -3.90E-07 -3.34E-07 2.35E-08 -2.70E-07 -3.99E-07 -3.35E-07 2.42E-08 -2.69E-07 -4.02E-07 -3.28E-07 2.29E-08 -2.65E-07 -3.91E-07 -3.15E-07 -3.28E-07 -3.36E-07 -3.42E-07 -3.57E-07 -3.56E-07 -3.32E-07 1.72E-08 1.82E-08 2.05E-08 2.10E-08 2.25E-08 2.22E-08 1.99E-08 -2.68E-07 -2.78E-07 -2.80E-07 -2.84E-07 -2.95E-07 -2.95E-07 -2.77E-07 -3.62E-07 -3.78E-07 -3.92E-07 -3.99E-07 -4.19E-07 -4.17E-07 -3.87E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 57 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.26. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 58 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.26. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.16E-07 -2.94E-07 -2.85E-07 -3.41E-07 -3.30E-07 -2.75E-07 -3.15E-07 -3.44E-07 -3.08E-07 -3.23E-07 -3.02E-07 -2.97E-07 10 -3.20E-07 -3.00E-07 -2.90E-07 -3.48E-07 -3.35E-07 -2.88E-07 -3.26E-07 -3.58E-07 -3.20E-07 -3.37E-07 -3.01E-07 -2.97E-07 20 -3.25E-07 -3.03E-07 -2.92E-07 -3.53E-07 -3.39E-07 -2.94E-07 -3.32E-07 -3.69E-07 -3.25E-07 -3.49E-07 -2.99E-07 -2.95E-07 30 -3.27E-07 -3.04E-07 -2.94E-07 -3.53E-07 -3.41E-07 -2.99E-07 -3.37E-07 -3.78E-07 -3.32E-07 -3.55E-07 -2.98E-07 -2.93E-07 50 -3.33E-07 -3.12E-07 -2.98E-07 -3.61E-07 -3.51E-07 -3.12E-07 -3.54E-07 -3.98E-07 -3.48E-07 -3.70E-07 -2.98E-07 -2.93E-07 60 -3.33E-07 -3.12E-07 -2.98E-07 -3.60E-07 -3.51E-07 -3.11E-07 -3.52E-07 -3.97E-07 -3.46E-07 -3.68E-07 -2.97E-07 -2.93E-07 70 -3.27E-07 -3.05E-07 -2.93E-07 -3.55E-07 -3.41E-07 -2.91E-07 -3.30E-07 -3.67E-07 -3.23E-07 -3.40E-07 -2.97E-07 -2.93E-07 -3.13E-07 2.33E-08 -2.49E-07 -3.77E-07 -3.19E-07 2.41E-08 -2.53E-07 -3.85E-07 -3.22E-07 2.48E-08 -2.54E-07 -3.90E-07 -3.24E-07 2.47E-08 -2.56E-07 -3.91E-07 -3.31E-07 2.64E-08 -2.59E-07 -4.04E-07 -3.31E-07 2.61E-08 -2.59E-07 -4.02E-07 -3.24E-07 2.55E-08 -2.54E-07 -3.94E-07 -3.13E-07 -3.26E-07 -3.34E-07 -3.40E-07 -3.56E-07 -3.55E-07 -3.30E-07 2.51E-08 2.58E-08 2.78E-08 2.90E-08 3.15E-08 3.17E-08 2.76E-08 -2.44E-07 -2.55E-07 -2.58E-07 -2.61E-07 -2.70E-07 -2.68E-07 -2.55E-07 -3.82E-07 -3.97E-07 -4.10E-07 -4.20E-07 -4.43E-07 -4.42E-07 -4.06E-07 -7.15E-07 -7.65E-07 -8.15E-07 -8.15E-07 -8.65E-07 -8.65E-07 -8.65E-07 PASS PASS PASS PASS PASS PASS PASS 7.15E-07 7.65E-07 8.15E-07 8.15E-07 8.65E-07 8.65E-07 8.65E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 59 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 7.00E+03 6.00E+03 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.27. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 60 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.27. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 6.90E+03 5.65E+03 6.58E+03 5.77E+03 7.44E+03 7.03E+03 5.82E+03 6.43E+03 4.51E+03 6.73E+03 5.61E+03 5.18E+03 10 6.23E+03 4.90E+03 6.18E+03 5.26E+03 5.88E+03 6.52E+03 5.80E+03 5.87E+03 4.21E+03 6.43E+03 5.70E+03 5.06E+03 20 5.92E+03 5.18E+03 5.93E+03 5.11E+03 6.65E+03 6.41E+03 5.65E+03 5.60E+03 4.25E+03 5.77E+03 4.56E+03 4.97E+03 30 5.81E+03 4.94E+03 5.78E+03 4.88E+03 5.93E+03 5.69E+03 5.47E+03 5.70E+03 4.16E+03 5.65E+03 5.57E+03 4.90E+03 50 5.67E+03 4.91E+03 5.74E+03 4.95E+03 5.55E+03 6.24E+03 4.89E+03 5.17E+03 3.75E+03 5.42E+03 5.50E+03 4.95E+03 60 5.67E+03 4.75E+03 5.78E+03 5.07E+03 5.91E+03 6.03E+03 5.18E+03 5.43E+03 4.16E+03 5.75E+03 4.75E+03 4.79E+03 70 5.79E+03 4.98E+03 5.79E+03 5.05E+03 6.22E+03 6.39E+03 5.28E+03 5.68E+03 3.81E+03 5.57E+03 5.53E+03 4.19E+03 6.47E+03 7.58E+02 8.55E+03 4.39E+03 5.69E+03 5.87E+02 7.30E+03 4.08E+03 5.76E+03 6.34E+02 7.49E+03 4.02E+03 5.47E+03 5.10E+02 6.87E+03 4.07E+03 5.36E+03 4.03E+02 6.47E+03 4.26E+03 5.44E+03 5.04E+02 6.82E+03 4.05E+03 5.56E+03 5.32E+02 7.02E+03 4.10E+03 6.10E+03 5.77E+03 5.54E+03 5.33E+03 5.09E+03 5.31E+03 5.34E+03 9.99E+02 9.26E+02 7.89E+02 6.64E+02 9.05E+02 7.18E+02 9.52E+02 8.84E+03 8.31E+03 7.70E+03 7.15E+03 7.58E+03 7.28E+03 7.95E+03 3.36E+03 3.23E+03 3.37E+03 3.51E+03 2.61E+03 3.34E+03 2.73E+03 1.00E+03 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 61 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 8.00E+03 6.00E+03 4.00E+03 2.00E+03 0.00E+00 -2.00E+03 -4.00E+03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal A l 168-hr 70 Figure 5.28. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 62 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.28. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 5.60E+03 4.82E+03 7.04E+03 5.45E+03 5.57E+03 5.58E+03 5.54E+03 4.78E+03 1.38E+04 5.72E+03 5.49E+03 5.59E+03 10 5.14E+03 4.44E+03 6.80E+03 5.35E+03 5.17E+03 5.24E+03 5.24E+03 4.79E+03 1.00E+04 6.12E+03 5.34E+03 5.54E+03 20 5.21E+03 4.41E+03 6.40E+03 5.15E+03 5.45E+03 4.92E+03 5.53E+03 4.72E+03 5.16E+03 5.67E+03 4.92E+03 5.57E+03 30 4.96E+03 4.32E+03 6.73E+03 4.78E+03 5.44E+03 4.98E+03 5.13E+03 4.70E+03 6.30E+03 5.35E+03 5.17E+03 5.50E+03 50 5.05E+03 4.19E+03 6.19E+03 5.07E+03 5.19E+03 4.64E+03 4.76E+03 4.38E+03 5.31E+03 4.80E+03 5.69E+03 5.51E+03 60 4.80E+03 4.35E+03 6.29E+03 5.12E+03 5.02E+03 4.49E+03 4.92E+03 4.19E+03 5.60E+03 5.24E+03 5.28E+03 5.33E+03 70 4.99E+03 4.20E+03 6.22E+03 5.02E+03 5.09E+03 4.72E+03 5.15E+03 4.98E+03 5.54E+03 5.47E+03 5.16E+03 5.58E+03 5.70E+03 8.13E+02 7.93E+03 3.47E+03 5.38E+03 8.68E+02 7.76E+03 3.00E+03 5.32E+03 7.18E+02 7.29E+03 3.35E+03 5.25E+03 9.23E+02 7.78E+03 2.71E+03 5.14E+03 7.09E+02 7.08E+03 3.19E+03 5.12E+03 7.21E+02 7.09E+03 3.14E+03 5.10E+03 7.22E+02 7.08E+03 3.12E+03 7.08E+03 6.28E+03 5.20E+03 5.29E+03 4.78E+03 4.89E+03 5.17E+03 3.77E+03 2.15E+03 4.00E+02 6.11E+02 3.41E+02 5.63E+02 3.41E+02 1.74E+04 1.22E+04 6.30E+03 6.96E+03 5.71E+03 6.43E+03 6.11E+03 -3.26E+03 3.92E+02 4.10E+03 3.61E+03 3.84E+03 3.35E+03 4.23E+03 1.00E+03 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02 5.00E+02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 63 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.29. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 64 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.29. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 2.22E+03 2.06E+03 2.32E+03 2.03E+03 2.21E+03 2.46E+03 2.12E+03 2.25E+03 1.57E+03 2.41E+03 1.99E+03 1.79E+03 10 2.03E+03 1.93E+03 2.19E+03 1.89E+03 2.16E+03 2.30E+03 2.07E+03 2.13E+03 1.50E+03 2.25E+03 2.00E+03 1.79E+03 20 2.02E+03 1.89E+03 2.17E+03 1.86E+03 2.10E+03 2.26E+03 2.01E+03 2.11E+03 1.47E+03 2.24E+03 2.00E+03 1.77E+03 30 2.00E+03 1.86E+03 2.12E+03 1.79E+03 2.05E+03 2.15E+03 2.01E+03 2.03E+03 1.42E+03 2.16E+03 2.01E+03 1.76E+03 50 1.93E+03 1.80E+03 2.09E+03 1.76E+03 2.00E+03 2.05E+03 1.84E+03 2.02E+03 1.47E+03 2.14E+03 2.00E+03 1.80E+03 60 1.93E+03 1.81E+03 2.07E+03 1.75E+03 2.00E+03 2.06E+03 1.89E+03 2.00E+03 1.42E+03 2.04E+03 1.98E+03 1.93E+03 70 2.00E+03 1.85E+03 2.11E+03 1.80E+03 2.03E+03 2.23E+03 1.97E+03 2.06E+03 1.48E+03 2.16E+03 2.02E+03 1.78E+03 2.17E+03 1.22E+02 2.50E+03 1.83E+03 2.04E+03 1.34E+02 2.40E+03 1.67E+03 2.01E+03 1.32E+02 2.37E+03 1.64E+03 1.97E+03 1.37E+02 2.34E+03 1.59E+03 1.92E+03 1.38E+02 2.30E+03 1.54E+03 1.91E+03 1.31E+02 2.27E+03 1.55E+03 1.96E+03 1.31E+02 2.32E+03 1.60E+03 2.16E+03 2.05E+03 2.02E+03 1.95E+03 1.90E+03 1.88E+03 1.98E+03 3.58E+02 3.20E+02 3.21E+02 3.05E+02 2.66E+02 2.68E+02 2.96E+02 3.14E+03 2.93E+03 2.90E+03 2.79E+03 2.63E+03 2.61E+03 2.79E+03 1.18E+03 1.17E+03 1.14E+03 1.12E+03 1.18E+03 1.14E+03 1.17E+03 5.00E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 65 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.30. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 66 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.30. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 2.13E+03 1.85E+03 2.66E+03 2.22E+03 2.13E+03 2.10E+03 2.12E+03 2.02E+03 2.31E+03 2.14E+03 2.11E+03 1.98E+03 10 2.00E+03 1.71E+03 2.44E+03 2.07E+03 2.08E+03 1.95E+03 2.07E+03 2.08E+03 2.26E+03 2.05E+03 2.07E+03 2.07E+03 20 1.94E+03 1.69E+03 2.39E+03 1.94E+03 2.03E+03 2.02E+03 2.03E+03 1.89E+03 2.32E+03 2.08E+03 2.04E+03 2.07E+03 30 1.94E+03 1.69E+03 2.40E+03 1.98E+03 2.02E+03 1.96E+03 2.00E+03 1.64E+03 2.00E+03 2.07E+03 2.03E+03 2.21E+03 50 1.89E+03 1.60E+03 2.37E+03 1.90E+03 1.98E+03 1.81E+03 1.96E+03 1.59E+03 1.96E+03 1.80E+03 2.01E+03 2.08E+03 60 1.92E+03 1.64E+03 2.34E+03 1.91E+03 1.89E+03 1.80E+03 1.93E+03 1.69E+03 2.04E+03 1.99E+03 2.16E+03 2.07E+03 70 1.90E+03 1.62E+03 2.36E+03 1.96E+03 1.96E+03 1.85E+03 1.96E+03 1.80E+03 2.12E+03 2.01E+03 2.06E+03 2.08E+03 2.20E+03 2.93E+02 3.00E+03 1.39E+03 2.06E+03 2.60E+02 2.77E+03 1.35E+03 2.00E+03 2.55E+02 2.70E+03 1.30E+03 2.00E+03 2.57E+02 2.71E+03 1.30E+03 1.95E+03 2.76E+02 2.70E+03 1.19E+03 1.94E+03 2.49E+02 2.62E+03 1.26E+03 1.96E+03 2.64E+02 2.68E+03 1.23E+03 2.14E+03 2.08E+03 2.07E+03 1.93E+03 1.82E+03 1.89E+03 1.95E+03 1.04E+02 1.12E+02 1.59E+02 1.71E+02 1.53E+02 1.45E+02 1.27E+02 2.42E+03 2.39E+03 2.50E+03 2.40E+03 2.24E+03 2.28E+03 2.30E+03 1.85E+03 1.78E+03 1.63E+03 1.46E+03 1.40E+03 1.49E+03 1.60E+03 5.00E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 2.50E+02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 67 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ +/- 15 V, VCM=+/15 V #1 (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.31. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 68 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.31. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.06E+02 1.10E+02 1.12E+02 1.04E+02 1.06E+02 1.06E+02 1.15E+02 1.01E+02 1.05E+02 1.09E+02 1.10E+02 9.94E+01 10 1.06E+02 1.10E+02 1.13E+02 1.04E+02 1.06E+02 1.06E+02 1.15E+02 1.01E+02 1.05E+02 1.08E+02 1.10E+02 9.94E+01 20 1.06E+02 1.10E+02 1.13E+02 1.04E+02 1.06E+02 1.06E+02 1.14E+02 1.01E+02 1.05E+02 1.08E+02 1.10E+02 9.94E+01 30 1.06E+02 1.09E+02 1.14E+02 1.04E+02 1.07E+02 1.06E+02 1.14E+02 1.01E+02 1.05E+02 1.08E+02 1.10E+02 9.94E+01 50 1.06E+02 1.09E+02 1.15E+02 1.04E+02 1.07E+02 1.06E+02 1.14E+02 1.01E+02 1.05E+02 1.07E+02 1.10E+02 9.94E+01 60 1.06E+02 1.09E+02 1.14E+02 1.04E+02 1.06E+02 1.06E+02 1.14E+02 1.01E+02 1.05E+02 1.07E+02 1.10E+02 9.93E+01 70 1.07E+02 1.08E+02 1.17E+02 1.03E+02 1.06E+02 1.06E+02 1.13E+02 1.00E+02 1.05E+02 1.08E+02 1.10E+02 9.94E+01 1.08E+02 3.40E+00 1.17E+02 9.84E+01 1.08E+02 3.43E+00 1.17E+02 9.84E+01 1.08E+02 3.51E+00 1.18E+02 9.84E+01 1.08E+02 3.89E+00 1.19E+02 9.75E+01 1.08E+02 4.00E+00 1.19E+02 9.73E+01 1.08E+02 3.89E+00 1.19E+02 9.75E+01 1.08E+02 5.35E+00 1.23E+02 9.38E+01 1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.07E+02 1.06E+02 5.09E+00 5.01E+00 4.88E+00 4.89E+00 4.68E+00 4.76E+00 4.49E+00 1.21E+02 1.21E+02 1.20E+02 1.20E+02 1.19E+02 1.20E+02 1.19E+02 9.31E+01 9.32E+01 9.34E+01 9.34E+01 9.38E+01 9.36E+01 9.41E+01 9.00E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 69 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ +/- 15 V, VCM=+/15 V #2 (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.32. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 70 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.32. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.07E+02 9.90E+01 1.01E+02 1.13E+02 1.02E+02 1.02E+02 1.05E+02 1.01E+02 1.01E+02 1.03E+02 9.82E+01 1.14E+02 10 1.07E+02 9.90E+01 1.01E+02 1.13E+02 1.02E+02 1.02E+02 1.05E+02 1.01E+02 1.01E+02 1.03E+02 9.82E+01 1.14E+02 20 1.07E+02 9.89E+01 1.01E+02 1.14E+02 1.02E+02 1.02E+02 1.05E+02 1.01E+02 1.01E+02 1.03E+02 9.82E+01 1.15E+02 30 1.07E+02 9.89E+01 1.01E+02 1.14E+02 1.02E+02 1.02E+02 1.04E+02 1.01E+02 1.01E+02 1.03E+02 9.82E+01 1.15E+02 50 1.07E+02 9.89E+01 1.01E+02 1.15E+02 1.02E+02 1.02E+02 1.05E+02 1.01E+02 1.01E+02 1.03E+02 9.82E+01 1.14E+02 60 1.07E+02 9.89E+01 1.01E+02 1.15E+02 1.02E+02 1.02E+02 1.04E+02 1.01E+02 1.01E+02 1.03E+02 9.81E+01 1.15E+02 70 1.06E+02 9.83E+01 1.01E+02 1.17E+02 1.01E+02 1.02E+02 1.04E+02 1.01E+02 1.01E+02 1.02E+02 9.81E+01 1.14E+02 1.05E+02 5.76E+00 1.20E+02 8.88E+01 1.04E+02 5.85E+00 1.21E+02 8.84E+01 1.05E+02 6.04E+00 1.21E+02 8.80E+01 1.05E+02 6.15E+00 1.21E+02 8.78E+01 1.05E+02 6.37E+00 1.22E+02 8.72E+01 1.05E+02 6.33E+00 1.22E+02 8.73E+01 1.05E+02 7.58E+00 1.26E+02 8.40E+01 1.03E+02 1.02E+02 1.02E+02 1.02E+02 1.02E+02 1.02E+02 1.02E+02 1.61E+00 1.51E+00 1.47E+00 1.40E+00 1.41E+00 1.35E+00 1.05E+00 1.07E+02 1.07E+02 1.06E+02 1.06E+02 1.06E+02 1.06E+02 1.05E+02 9.81E+01 9.82E+01 9.83E+01 9.85E+01 9.84E+01 9.86E+01 9.90E+01 9.00E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 8.60E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 71 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.33. Plot of Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 72 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.33. Raw data for Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.23E+02 1.02E+02 1.04E+02 1.08E+02 1.11E+02 1.11E+02 1.08E+02 1.32E+02 1.10E+02 1.10E+02 1.01E+02 1.01E+02 10 1.25E+02 1.02E+02 1.03E+02 1.08E+02 1.10E+02 1.11E+02 1.08E+02 1.30E+02 1.09E+02 1.10E+02 1.01E+02 1.01E+02 20 1.27E+02 1.02E+02 1.03E+02 1.08E+02 1.10E+02 1.11E+02 1.08E+02 1.25E+02 1.09E+02 1.10E+02 1.01E+02 1.01E+02 30 1.26E+02 1.02E+02 1.03E+02 1.08E+02 1.10E+02 1.11E+02 1.08E+02 1.25E+02 1.09E+02 1.10E+02 1.01E+02 1.01E+02 50 1.29E+02 1.02E+02 1.03E+02 1.07E+02 1.10E+02 1.10E+02 1.08E+02 1.22E+02 1.09E+02 1.10E+02 1.01E+02 1.01E+02 60 1.30E+02 1.02E+02 1.03E+02 1.08E+02 1.10E+02 1.10E+02 1.08E+02 1.22E+02 1.09E+02 1.10E+02 1.01E+02 1.01E+02 70 1.24E+02 1.02E+02 1.02E+02 1.05E+02 1.08E+02 1.10E+02 1.07E+02 1.26E+02 1.10E+02 1.08E+02 1.01E+02 1.01E+02 1.10E+02 8.44E+00 1.33E+02 8.64E+01 1.10E+02 9.26E+00 1.35E+02 8.43E+01 1.10E+02 1.00E+01 1.37E+02 8.25E+01 1.10E+02 9.84E+00 1.37E+02 8.27E+01 1.10E+02 1.12E+01 1.41E+02 7.97E+01 1.11E+02 1.14E+01 1.42E+02 7.92E+01 1.08E+02 9.19E+00 1.34E+02 8.32E+01 1.14E+02 1.14E+02 1.13E+02 1.12E+02 1.12E+02 1.12E+02 1.12E+02 9.78E+00 9.06E+00 6.90E+00 6.94E+00 5.82E+00 5.82E+00 7.61E+00 1.41E+02 1.38E+02 1.32E+02 1.32E+02 1.28E+02 1.28E+02 1.33E+02 8.74E+01 8.87E+01 9.37E+01 9.35E+01 9.61E+01 9.61E+01 9.11E+01 8.40E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 73 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.34. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 74 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.34. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.52E+02 1.08E+02 10 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.52E+02 1.08E+02 20 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.55E+02 1.08E+02 30 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.53E+02 1.08E+02 50 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.51E+02 1.08E+02 60 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.51E+02 1.08E+02 70 1.05E+02 1.10E+02 1.03E+02 1.06E+02 1.10E+02 1.09E+02 1.18E+02 1.10E+02 1.01E+02 1.13E+02 1.49E+02 1.08E+02 1.07E+02 2.96E+00 1.15E+02 9.88E+01 1.07E+02 2.97E+00 1.15E+02 9.88E+01 1.07E+02 3.01E+00 1.15E+02 9.87E+01 1.07E+02 3.05E+00 1.15E+02 9.85E+01 1.07E+02 3.08E+00 1.15E+02 9.84E+01 1.07E+02 3.07E+00 1.15E+02 9.85E+01 1.07E+02 3.11E+00 1.15E+02 9.83E+01 1.10E+02 1.10E+02 1.10E+02 1.10E+02 1.10E+02 1.10E+02 1.10E+02 6.30E+00 6.30E+00 6.30E+00 6.33E+00 6.32E+00 6.36E+00 6.31E+00 1.27E+02 1.27E+02 1.27E+02 1.27E+02 1.27E+02 1.28E+02 1.27E+02 9.28E+01 9.28E+01 9.28E+01 9.27E+01 9.27E+01 9.27E+01 9.27E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 75 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.35. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 76 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.35. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.18E+02 1.03E+02 9.86E+01 1.06E+02 1.10E+02 1.17E+02 1.12E+02 1.10E+02 1.02E+02 1.06E+02 1.14E+02 1.04E+02 10 1.18E+02 1.03E+02 9.86E+01 1.06E+02 1.10E+02 1.17E+02 1.12E+02 1.10E+02 1.02E+02 1.06E+02 1.14E+02 1.04E+02 20 1.18E+02 1.03E+02 9.85E+01 1.06E+02 1.10E+02 1.17E+02 1.12E+02 1.09E+02 1.01E+02 1.06E+02 1.14E+02 1.04E+02 30 1.18E+02 1.03E+02 9.85E+01 1.06E+02 1.10E+02 1.16E+02 1.12E+02 1.09E+02 1.01E+02 1.06E+02 1.14E+02 1.04E+02 50 1.18E+02 1.03E+02 9.85E+01 1.06E+02 1.10E+02 1.17E+02 1.12E+02 1.09E+02 1.01E+02 1.06E+02 1.14E+02 1.04E+02 60 1.18E+02 1.03E+02 9.85E+01 1.06E+02 1.10E+02 1.16E+02 1.12E+02 1.09E+02 1.01E+02 1.06E+02 1.14E+02 1.04E+02 70 1.18E+02 1.03E+02 9.85E+01 1.06E+02 1.10E+02 1.16E+02 1.12E+02 1.09E+02 1.01E+02 1.06E+02 1.14E+02 1.04E+02 1.07E+02 7.37E+00 1.27E+02 8.70E+01 1.07E+02 7.31E+00 1.27E+02 8.71E+01 1.07E+02 7.30E+00 1.27E+02 8.71E+01 1.07E+02 7.31E+00 1.27E+02 8.70E+01 1.07E+02 7.27E+00 1.27E+02 8.71E+01 1.07E+02 7.26E+00 1.27E+02 8.71E+01 1.07E+02 7.29E+00 1.27E+02 8.70E+01 1.09E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02 1.09E+02 5.84E+00 5.87E+00 5.80E+00 5.73E+00 5.78E+00 5.71E+00 5.67E+00 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.24E+02 9.32E+01 9.31E+01 9.32E+01 9.32E+01 9.32E+01 9.33E+01 9.34E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 9.00E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 77 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.36. Plot of Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 78 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.36. Raw data for Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.03E+02 1.00E+02 1.06E+02 1.30E+02 1.51E+02 1.14E+02 1.18E+02 1.04E+02 9.51E+01 1.11E+02 1.14E+02 9.94E+01 10 1.03E+02 1.00E+02 1.06E+02 1.30E+02 1.48E+02 1.13E+02 1.18E+02 1.04E+02 9.51E+01 1.11E+02 1.14E+02 9.94E+01 20 1.03E+02 1.00E+02 1.06E+02 1.29E+02 1.54E+02 1.13E+02 1.18E+02 1.04E+02 9.50E+01 1.11E+02 1.14E+02 9.94E+01 30 1.03E+02 1.00E+02 1.06E+02 1.29E+02 1.49E+02 1.14E+02 1.18E+02 1.04E+02 9.50E+01 1.10E+02 1.14E+02 9.94E+01 50 1.03E+02 1.00E+02 1.06E+02 1.28E+02 1.52E+02 1.13E+02 1.18E+02 1.04E+02 9.50E+01 1.11E+02 1.14E+02 9.94E+01 60 1.03E+02 1.00E+02 1.06E+02 1.28E+02 1.98E+02 1.14E+02 1.18E+02 1.04E+02 9.50E+01 1.10E+02 1.14E+02 9.94E+01 70 1.03E+02 1.00E+02 1.06E+02 1.31E+02 1.52E+02 1.14E+02 1.18E+02 1.04E+02 9.50E+01 1.10E+02 1.14E+02 9.94E+01 1.18E+02 2.18E+01 1.78E+02 5.84E+01 1.17E+02 2.08E+01 1.74E+02 6.06E+01 1.19E+02 2.28E+01 1.81E+02 5.60E+01 1.18E+02 2.11E+01 1.75E+02 5.97E+01 1.18E+02 2.18E+01 1.78E+02 5.80E+01 1.27E+02 4.13E+01 2.40E+02 1.40E+01 1.19E+02 2.25E+01 1.80E+02 5.70E+01 1.08E+02 1.08E+02 1.08E+02 1.08E+02 1.08E+02 1.08E+02 1.08E+02 9.11E+00 9.10E+00 9.07E+00 9.00E+00 9.03E+00 8.99E+00 9.03E+00 1.33E+02 1.33E+02 1.33E+02 1.33E+02 1.33E+02 1.33E+02 1.33E+02 8.33E+01 8.33E+01 8.33E+01 8.34E+01 8.34E+01 8.35E+01 8.34E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 8.30E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 79 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.37. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 80 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.37. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.88E-03 2.89E-03 3.05E-03 2.73E-03 3.01E-03 2.88E-03 2.93E-03 2.83E-03 2.74E-03 3.11E-03 2.81E-03 2.86E-03 10 2.93E-03 2.74E-03 3.11E-03 2.86E-03 3.16E-03 3.20E-03 3.11E-03 3.01E-03 2.94E-03 3.15E-03 2.89E-03 3.13E-03 20 3.18E-03 2.98E-03 3.21E-03 3.13E-03 3.31E-03 3.20E-03 3.13E-03 3.13E-03 3.05E-03 3.30E-03 2.84E-03 2.96E-03 30 3.26E-03 2.99E-03 3.31E-03 2.80E-03 3.23E-03 3.11E-03 3.11E-03 3.14E-03 2.89E-03 3.18E-03 2.87E-03 3.01E-03 50 3.32E-03 2.90E-03 3.44E-03 3.00E-03 3.35E-03 3.20E-03 3.30E-03 3.28E-03 3.17E-03 3.40E-03 2.86E-03 2.86E-03 60 3.29E-03 2.97E-03 3.46E-03 3.09E-03 3.29E-03 3.44E-03 3.36E-03 3.19E-03 3.00E-03 3.49E-03 2.99E-03 3.04E-03 70 3.10E-03 3.00E-03 3.20E-03 2.93E-03 3.30E-03 3.19E-03 3.12E-03 3.13E-03 2.92E-03 3.20E-03 2.92E-03 3.10E-03 2.91E-03 1.26E-04 3.26E-03 2.57E-03 2.96E-03 1.74E-04 3.44E-03 2.48E-03 3.16E-03 1.21E-04 3.49E-03 2.83E-03 3.12E-03 2.16E-04 3.71E-03 2.53E-03 3.20E-03 2.37E-04 3.85E-03 2.55E-03 3.22E-03 1.92E-04 3.75E-03 2.69E-03 3.11E-03 1.49E-04 3.51E-03 2.70E-03 2.90E-03 3.08E-03 3.16E-03 3.09E-03 3.27E-03 3.30E-03 3.11E-03 1.38E-04 1.06E-04 9.36E-05 1.13E-04 9.06E-05 2.01E-04 1.13E-04 3.28E-03 3.37E-03 3.42E-03 3.40E-03 3.52E-03 3.85E-03 3.42E-03 2.52E-03 2.79E-03 2.91E-03 2.78E-03 3.02E-03 2.75E-03 2.80E-03 1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 81 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.38. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 82 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.38. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.86E-03 2.59E-03 2.96E-03 2.66E-03 3.16E-03 3.21E-03 2.91E-03 2.66E-03 2.74E-03 2.93E-03 2.79E-03 2.91E-03 10 3.01E-03 2.74E-03 3.10E-03 2.89E-03 3.06E-03 3.13E-03 3.10E-03 2.98E-03 2.96E-03 3.18E-03 3.01E-03 2.98E-03 20 3.20E-03 2.79E-03 3.18E-03 3.20E-03 3.26E-03 3.25E-03 3.15E-03 3.11E-03 2.93E-03 3.23E-03 2.98E-03 2.96E-03 30 3.28E-03 2.86E-03 3.31E-03 2.96E-03 3.36E-03 3.33E-03 3.12E-03 2.99E-03 2.99E-03 3.29E-03 2.92E-03 2.89E-03 50 3.32E-03 2.88E-03 3.27E-03 3.18E-03 3.42E-03 3.22E-03 3.08E-03 3.28E-03 3.03E-03 3.42E-03 2.95E-03 2.86E-03 60 3.32E-03 2.95E-03 3.37E-03 3.31E-03 3.49E-03 3.47E-03 3.31E-03 3.36E-03 3.07E-03 3.41E-03 2.95E-03 2.94E-03 70 3.15E-03 2.92E-03 3.35E-03 3.08E-03 3.24E-03 3.32E-03 3.20E-03 3.05E-03 2.97E-03 3.27E-03 2.97E-03 3.02E-03 2.85E-03 2.30E-04 3.48E-03 2.21E-03 2.96E-03 1.46E-04 3.36E-03 2.56E-03 3.13E-03 1.90E-04 3.65E-03 2.60E-03 3.15E-03 2.27E-04 3.78E-03 2.53E-03 3.21E-03 2.06E-04 3.78E-03 2.65E-03 3.29E-03 2.02E-04 3.84E-03 2.73E-03 3.15E-03 1.63E-04 3.59E-03 2.70E-03 2.89E-03 3.07E-03 3.13E-03 3.14E-03 3.21E-03 3.32E-03 3.16E-03 2.12E-04 9.59E-05 1.28E-04 1.61E-04 1.57E-04 1.54E-04 1.48E-04 3.47E-03 3.33E-03 3.48E-03 3.59E-03 3.64E-03 3.75E-03 3.57E-03 2.31E-03 2.81E-03 2.78E-03 2.70E-03 2.78E-03 2.90E-03 2.76E-03 1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 83 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.39. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 84 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.39. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 6.50E-02 6.19E-02 6.71E-02 6.17E-02 6.73E-02 6.72E-02 6.45E-02 6.43E-02 6.26E-02 6.71E-02 6.53E-02 6.64E-02 10 6.65E-02 6.32E-02 6.86E-02 6.28E-02 6.85E-02 6.77E-02 6.55E-02 6.49E-02 6.31E-02 6.78E-02 6.54E-02 6.64E-02 20 6.71E-02 6.37E-02 6.93E-02 6.38E-02 6.94E-02 6.86E-02 6.58E-02 6.56E-02 6.39E-02 6.83E-02 6.56E-02 6.66E-02 30 6.79E-02 6.46E-02 7.00E-02 6.42E-02 7.00E-02 6.89E-02 6.64E-02 6.58E-02 6.41E-02 6.87E-02 6.56E-02 6.69E-02 50 6.83E-02 6.46E-02 7.05E-02 6.47E-02 7.06E-02 6.94E-02 6.66E-02 6.64E-02 6.45E-02 6.95E-02 6.59E-02 6.71E-02 60 6.82E-02 6.48E-02 7.03E-02 6.47E-02 7.03E-02 6.94E-02 6.66E-02 6.65E-02 6.45E-02 6.96E-02 6.59E-02 6.68E-02 70 6.78E-02 6.48E-02 7.01E-02 6.44E-02 7.03E-02 6.91E-02 6.63E-02 6.60E-02 6.43E-02 6.89E-02 6.60E-02 6.71E-02 6.46E-02 2.71E-03 7.20E-02 5.72E-02 6.59E-02 2.79E-03 7.36E-02 5.82E-02 6.67E-02 2.82E-03 7.44E-02 5.89E-02 6.73E-02 2.82E-03 7.51E-02 5.96E-02 6.78E-02 2.96E-03 7.59E-02 5.97E-02 6.77E-02 2.78E-03 7.53E-02 6.00E-02 6.75E-02 2.82E-03 7.52E-02 5.97E-02 6.51E-02 6.58E-02 6.64E-02 6.68E-02 6.73E-02 6.73E-02 6.69E-02 1.99E-03 2.00E-03 1.97E-03 2.05E-03 2.15E-03 2.15E-03 2.04E-03 7.06E-02 7.13E-02 7.19E-02 7.24E-02 7.32E-02 7.32E-02 7.25E-02 5.97E-02 6.03E-02 6.10E-02 6.12E-02 6.14E-02 6.14E-02 6.13E-02 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 85 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.40. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 86 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.40. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 6.48E-02 6.06E-02 6.68E-02 6.14E-02 6.72E-02 6.78E-02 6.44E-02 6.35E-02 6.28E-02 6.64E-02 6.55E-02 6.60E-02 10 6.65E-02 6.19E-02 6.81E-02 6.27E-02 6.87E-02 6.85E-02 6.50E-02 6.41E-02 6.33E-02 6.72E-02 6.57E-02 6.60E-02 20 6.70E-02 6.26E-02 6.89E-02 6.33E-02 6.94E-02 6.89E-02 6.57E-02 6.45E-02 6.39E-02 6.79E-02 6.59E-02 6.64E-02 30 6.76E-02 6.32E-02 6.95E-02 6.40E-02 7.02E-02 6.94E-02 6.61E-02 6.51E-02 6.42E-02 6.84E-02 6.62E-02 6.66E-02 50 6.80E-02 6.33E-02 6.99E-02 6.46E-02 7.07E-02 6.96E-02 6.65E-02 6.55E-02 6.48E-02 6.86E-02 6.62E-02 6.66E-02 60 6.80E-02 6.34E-02 7.02E-02 6.46E-02 7.08E-02 6.97E-02 6.64E-02 6.56E-02 6.48E-02 6.90E-02 6.61E-02 6.66E-02 70 6.78E-02 6.33E-02 6.99E-02 6.41E-02 7.05E-02 6.92E-02 6.61E-02 6.48E-02 6.44E-02 6.84E-02 6.63E-02 6.67E-02 6.42E-02 3.02E-03 7.24E-02 5.59E-02 6.56E-02 3.13E-03 7.42E-02 5.70E-02 6.62E-02 3.15E-03 7.49E-02 5.76E-02 6.69E-02 3.15E-03 7.56E-02 5.83E-02 6.73E-02 3.24E-03 7.62E-02 5.84E-02 6.74E-02 3.30E-03 7.65E-02 5.83E-02 6.71E-02 3.29E-03 7.61E-02 5.81E-02 6.50E-02 6.56E-02 6.62E-02 6.66E-02 6.70E-02 6.71E-02 6.66E-02 2.06E-03 2.15E-03 2.16E-03 2.19E-03 2.03E-03 2.13E-03 2.16E-03 7.06E-02 7.15E-02 7.21E-02 7.26E-02 7.26E-02 7.29E-02 7.25E-02 5.93E-02 5.97E-02 6.03E-02 6.06E-02 6.14E-02 6.13E-02 6.07E-02 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 87 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 9.00E-01 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.41. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 88 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.41. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.16E-01 3.07E-01 3.24E-01 3.03E-01 3.25E-01 3.27E-01 3.15E-01 3.14E-01 3.07E-01 3.24E-01 3.19E-01 3.23E-01 10 3.20E-01 3.10E-01 3.28E-01 3.07E-01 3.29E-01 3.30E-01 3.18E-01 3.16E-01 3.09E-01 3.28E-01 3.20E-01 3.24E-01 20 3.22E-01 3.12E-01 3.30E-01 3.09E-01 3.31E-01 3.32E-01 3.20E-01 3.18E-01 3.12E-01 3.30E-01 3.22E-01 3.25E-01 30 3.24E-01 3.15E-01 3.32E-01 3.11E-01 3.34E-01 3.35E-01 3.22E-01 3.21E-01 3.13E-01 3.32E-01 3.23E-01 3.26E-01 50 3.25E-01 3.16E-01 3.34E-01 3.12E-01 3.36E-01 3.36E-01 3.24E-01 3.22E-01 3.15E-01 3.34E-01 3.23E-01 3.26E-01 60 3.26E-01 3.16E-01 3.34E-01 3.12E-01 3.36E-01 3.36E-01 3.23E-01 3.23E-01 3.15E-01 3.34E-01 3.23E-01 3.26E-01 70 3.25E-01 3.15E-01 3.33E-01 3.11E-01 3.35E-01 3.34E-01 3.22E-01 3.20E-01 3.13E-01 3.32E-01 3.23E-01 3.26E-01 3.15E-01 9.85E-03 3.42E-01 2.88E-01 3.19E-01 9.91E-03 3.46E-01 2.91E-01 3.21E-01 1.03E-02 3.49E-01 2.93E-01 3.23E-01 1.00E-02 3.51E-01 2.96E-01 3.25E-01 1.04E-02 3.53E-01 2.96E-01 3.25E-01 1.05E-02 3.54E-01 2.96E-01 3.24E-01 1.05E-02 3.53E-01 2.95E-01 3.18E-01 3.20E-01 3.22E-01 3.24E-01 3.26E-01 3.26E-01 3.24E-01 8.06E-03 8.42E-03 8.38E-03 8.88E-03 8.77E-03 8.65E-03 8.64E-03 3.40E-01 3.43E-01 3.45E-01 3.49E-01 3.50E-01 3.50E-01 3.48E-01 2.95E-01 2.97E-01 2.99E-01 3.00E-01 3.02E-01 3.03E-01 3.01E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 89 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 9.00E-01 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.42. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 90 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.42. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.16E-01 3.03E-01 3.23E-01 3.03E-01 3.26E-01 3.29E-01 3.15E-01 3.11E-01 3.08E-01 3.22E-01 3.21E-01 3.22E-01 10 3.20E-01 3.05E-01 3.26E-01 3.06E-01 3.29E-01 3.31E-01 3.17E-01 3.14E-01 3.10E-01 3.25E-01 3.22E-01 3.22E-01 20 3.22E-01 3.07E-01 3.29E-01 3.08E-01 3.32E-01 3.34E-01 3.19E-01 3.16E-01 3.13E-01 3.27E-01 3.23E-01 3.24E-01 30 3.24E-01 3.10E-01 3.31E-01 3.10E-01 3.34E-01 3.36E-01 3.21E-01 3.18E-01 3.14E-01 3.30E-01 3.24E-01 3.25E-01 50 3.25E-01 3.11E-01 3.33E-01 3.12E-01 3.36E-01 3.38E-01 3.23E-01 3.20E-01 3.15E-01 3.31E-01 3.24E-01 3.25E-01 60 3.25E-01 3.11E-01 3.33E-01 3.12E-01 3.36E-01 3.38E-01 3.23E-01 3.20E-01 3.15E-01 3.32E-01 3.24E-01 3.25E-01 70 3.25E-01 3.10E-01 3.32E-01 3.11E-01 3.35E-01 3.36E-01 3.21E-01 3.18E-01 3.14E-01 3.29E-01 3.24E-01 3.25E-01 3.14E-01 1.08E-02 3.44E-01 2.84E-01 3.17E-01 1.12E-02 3.48E-01 2.86E-01 3.19E-01 1.14E-02 3.51E-01 2.88E-01 3.22E-01 1.14E-02 3.53E-01 2.91E-01 3.23E-01 1.17E-02 3.55E-01 2.91E-01 3.23E-01 1.17E-02 3.55E-01 2.91E-01 3.23E-01 1.16E-02 3.54E-01 2.91E-01 3.17E-01 3.19E-01 3.22E-01 3.24E-01 3.26E-01 3.25E-01 3.24E-01 8.44E-03 8.73E-03 8.70E-03 9.07E-03 9.05E-03 9.03E-03 8.72E-03 3.40E-01 3.43E-01 3.46E-01 3.49E-01 3.50E-01 3.50E-01 3.48E-01 2.94E-01 2.95E-01 2.98E-01 2.99E-01 3.01E-01 3.01E-01 3.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 8.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 91 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.43. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 92 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.43. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.90E-02 1.98E-02 2.01E-02 1.95E-02 1.81E-02 1.96E-02 1.94E-02 1.82E-02 1.92E-02 1.82E-02 1.88E-02 1.92E-02 10 1.94E-02 2.01E-02 2.05E-02 2.00E-02 1.86E-02 1.99E-02 1.99E-02 1.85E-02 1.96E-02 1.85E-02 1.91E-02 1.92E-02 20 1.98E-02 2.05E-02 2.06E-02 2.02E-02 1.88E-02 2.01E-02 2.01E-02 1.89E-02 1.97E-02 1.87E-02 1.91E-02 1.95E-02 30 1.97E-02 2.07E-02 2.10E-02 2.04E-02 1.90E-02 2.05E-02 2.04E-02 1.90E-02 1.99E-02 1.90E-02 1.92E-02 1.95E-02 50 2.00E-02 2.09E-02 2.10E-02 2.06E-02 1.90E-02 2.05E-02 2.05E-02 1.93E-02 2.01E-02 1.93E-02 1.93E-02 1.96E-02 60 2.00E-02 2.08E-02 2.10E-02 2.06E-02 1.91E-02 2.05E-02 2.03E-02 1.93E-02 2.01E-02 1.92E-02 1.94E-02 1.96E-02 70 2.00E-02 2.06E-02 2.10E-02 2.04E-02 1.90E-02 2.02E-02 2.02E-02 1.90E-02 1.98E-02 1.88E-02 1.93E-02 1.95E-02 1.93E-02 7.72E-04 2.14E-02 1.72E-02 1.97E-02 7.32E-04 2.17E-02 1.77E-02 2.00E-02 7.37E-04 2.20E-02 1.79E-02 2.02E-02 8.00E-04 2.24E-02 1.80E-02 2.03E-02 8.43E-04 2.26E-02 1.80E-02 2.03E-02 7.60E-04 2.24E-02 1.82E-02 2.02E-02 7.67E-04 2.23E-02 1.81E-02 1.89E-02 1.93E-02 1.95E-02 1.98E-02 1.99E-02 1.99E-02 1.96E-02 6.99E-04 7.25E-04 6.69E-04 6.93E-04 6.40E-04 5.85E-04 6.80E-04 2.08E-02 2.12E-02 2.13E-02 2.17E-02 2.17E-02 2.15E-02 2.15E-02 1.70E-02 1.73E-02 1.77E-02 1.79E-02 1.82E-02 1.83E-02 1.77E-02 3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 93 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.44. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 94 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.44. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.94E-02 2.04E-02 2.05E-02 1.99E-02 1.81E-02 1.97E-02 1.98E-02 1.84E-02 1.96E-02 1.87E-02 1.90E-02 1.90E-02 10 1.99E-02 2.05E-02 2.09E-02 2.02E-02 1.85E-02 2.01E-02 2.01E-02 1.86E-02 1.96E-02 1.91E-02 1.93E-02 1.91E-02 20 1.99E-02 2.10E-02 2.12E-02 2.05E-02 1.87E-02 2.01E-02 2.04E-02 1.89E-02 2.01E-02 1.92E-02 1.94E-02 1.92E-02 30 2.04E-02 2.11E-02 2.13E-02 2.07E-02 1.90E-02 2.05E-02 2.06E-02 1.88E-02 2.02E-02 1.95E-02 1.97E-02 1.92E-02 50 2.03E-02 2.13E-02 2.16E-02 2.09E-02 1.92E-02 2.07E-02 2.07E-02 1.93E-02 2.05E-02 1.97E-02 1.97E-02 1.92E-02 60 2.04E-02 2.13E-02 2.14E-02 2.07E-02 1.92E-02 2.05E-02 2.08E-02 1.91E-02 2.04E-02 1.99E-02 1.95E-02 1.94E-02 70 2.02E-02 2.12E-02 2.13E-02 2.08E-02 1.90E-02 2.04E-02 2.05E-02 1.91E-02 2.00E-02 1.94E-02 1.95E-02 1.94E-02 1.97E-02 9.49E-04 2.23E-02 1.71E-02 2.00E-02 9.18E-04 2.25E-02 1.75E-02 2.03E-02 9.98E-04 2.30E-02 1.75E-02 2.05E-02 9.25E-04 2.30E-02 1.79E-02 2.07E-02 9.40E-04 2.32E-02 1.81E-02 2.06E-02 8.94E-04 2.31E-02 1.82E-02 2.05E-02 9.28E-04 2.30E-02 1.79E-02 1.92E-02 1.95E-02 1.97E-02 1.99E-02 2.02E-02 2.01E-02 1.99E-02 6.32E-04 6.45E-04 6.48E-04 7.36E-04 6.43E-04 6.68E-04 6.13E-04 2.10E-02 2.12E-02 2.15E-02 2.19E-02 2.19E-02 2.20E-02 2.15E-02 1.75E-02 1.77E-02 1.80E-02 1.79E-02 1.84E-02 1.83E-02 1.82E-02 3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 95 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.45. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 96 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.45. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 5.36E-02 5.38E-02 5.43E-02 5.35E-02 5.23E-02 5.44E-02 5.36E-02 5.21E-02 5.32E-02 5.27E-02 5.32E-02 5.35E-02 10 5.43E-02 5.46E-02 5.46E-02 5.41E-02 5.27E-02 5.49E-02 5.38E-02 5.25E-02 5.36E-02 5.30E-02 5.32E-02 5.37E-02 20 5.45E-02 5.47E-02 5.51E-02 5.45E-02 5.31E-02 5.52E-02 5.40E-02 5.28E-02 5.40E-02 5.34E-02 5.35E-02 5.39E-02 30 5.50E-02 5.51E-02 5.52E-02 5.49E-02 5.35E-02 5.55E-02 5.45E-02 5.31E-02 5.40E-02 5.36E-02 5.38E-02 5.42E-02 50 5.50E-02 5.52E-02 5.56E-02 5.49E-02 5.37E-02 5.56E-02 5.47E-02 5.33E-02 5.41E-02 5.38E-02 5.38E-02 5.40E-02 60 5.50E-02 5.52E-02 5.54E-02 5.50E-02 5.37E-02 5.57E-02 5.48E-02 5.33E-02 5.44E-02 5.38E-02 5.38E-02 5.41E-02 70 5.51E-02 5.50E-02 5.54E-02 5.47E-02 5.36E-02 5.55E-02 5.45E-02 5.32E-02 5.41E-02 5.37E-02 5.38E-02 5.43E-02 5.35E-02 7.53E-04 5.56E-02 5.14E-02 5.40E-02 7.81E-04 5.62E-02 5.19E-02 5.44E-02 7.79E-04 5.65E-02 5.22E-02 5.47E-02 6.85E-04 5.66E-02 5.28E-02 5.49E-02 7.02E-04 5.68E-02 5.30E-02 5.49E-02 6.85E-04 5.67E-02 5.30E-02 5.48E-02 6.69E-04 5.66E-02 5.29E-02 5.32E-02 5.35E-02 5.39E-02 5.42E-02 5.43E-02 5.44E-02 5.42E-02 8.77E-04 9.06E-04 9.07E-04 9.32E-04 8.87E-04 9.34E-04 8.89E-04 5.56E-02 5.60E-02 5.64E-02 5.67E-02 5.67E-02 5.70E-02 5.66E-02 5.08E-02 5.11E-02 5.14E-02 5.16E-02 5.19E-02 5.18E-02 5.18E-02 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 97 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.46. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 98 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.46. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 5.42E-02 5.44E-02 5.49E-02 5.41E-02 5.27E-02 5.46E-02 5.41E-02 5.23E-02 5.38E-02 5.34E-02 5.35E-02 5.37E-02 10 5.48E-02 5.49E-02 5.55E-02 5.48E-02 5.30E-02 5.50E-02 5.44E-02 5.25E-02 5.40E-02 5.37E-02 5.37E-02 5.37E-02 20 5.49E-02 5.52E-02 5.59E-02 5.52E-02 5.35E-02 5.52E-02 5.48E-02 5.29E-02 5.46E-02 5.40E-02 5.39E-02 5.41E-02 30 5.54E-02 5.57E-02 5.60E-02 5.54E-02 5.36E-02 5.56E-02 5.50E-02 5.32E-02 5.47E-02 5.42E-02 5.40E-02 5.44E-02 50 5.54E-02 5.57E-02 5.63E-02 5.57E-02 5.39E-02 5.57E-02 5.52E-02 5.35E-02 5.47E-02 5.47E-02 5.40E-02 5.41E-02 60 5.56E-02 5.58E-02 5.63E-02 5.55E-02 5.39E-02 5.56E-02 5.54E-02 5.35E-02 5.49E-02 5.46E-02 5.40E-02 5.42E-02 70 5.55E-02 5.56E-02 5.61E-02 5.53E-02 5.40E-02 5.54E-02 5.51E-02 5.33E-02 5.47E-02 5.44E-02 5.41E-02 5.43E-02 5.40E-02 7.92E-04 5.62E-02 5.19E-02 5.46E-02 9.46E-04 5.72E-02 5.20E-02 5.49E-02 8.85E-04 5.74E-02 5.25E-02 5.52E-02 9.42E-04 5.78E-02 5.26E-02 5.54E-02 8.99E-04 5.78E-02 5.29E-02 5.54E-02 8.83E-04 5.78E-02 5.30E-02 5.53E-02 7.91E-04 5.75E-02 5.31E-02 5.37E-02 5.39E-02 5.43E-02 5.46E-02 5.48E-02 5.48E-02 5.46E-02 8.93E-04 9.03E-04 8.93E-04 9.03E-04 8.34E-04 8.53E-04 8.27E-04 5.61E-02 5.64E-02 5.67E-02 5.70E-02 5.70E-02 5.71E-02 5.68E-02 5.12E-02 5.14E-02 5.18E-02 5.21E-02 5.25E-02 5.25E-02 5.23E-02 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 99 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.47. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 100 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.47. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.18E-01 2.17E-01 2.11E-01 2.17E-01 2.12E-01 2.16E-01 2.13E-01 2.11E-01 2.14E-01 2.13E-01 2.13E-01 2.13E-01 10 2.20E-01 2.18E-01 2.12E-01 2.18E-01 2.13E-01 2.17E-01 2.14E-01 2.12E-01 2.15E-01 2.14E-01 2.14E-01 2.14E-01 20 2.20E-01 2.19E-01 2.13E-01 2.19E-01 2.14E-01 2.18E-01 2.15E-01 2.13E-01 2.17E-01 2.15E-01 2.15E-01 2.14E-01 30 2.22E-01 2.21E-01 2.14E-01 2.20E-01 2.16E-01 2.19E-01 2.16E-01 2.14E-01 2.17E-01 2.16E-01 2.16E-01 2.16E-01 50 2.22E-01 2.20E-01 2.14E-01 2.21E-01 2.16E-01 2.19E-01 2.16E-01 2.14E-01 2.17E-01 2.17E-01 2.16E-01 2.15E-01 60 2.22E-01 2.21E-01 2.15E-01 2.21E-01 2.16E-01 2.19E-01 2.16E-01 2.14E-01 2.17E-01 2.17E-01 2.16E-01 2.15E-01 70 2.22E-01 2.20E-01 2.14E-01 2.20E-01 2.15E-01 2.20E-01 2.16E-01 2.14E-01 2.17E-01 2.16E-01 2.16E-01 2.15E-01 2.15E-01 3.07E-03 2.24E-01 2.07E-01 2.16E-01 3.25E-03 2.25E-01 2.07E-01 2.17E-01 3.18E-03 2.26E-01 2.08E-01 2.19E-01 3.34E-03 2.28E-01 2.09E-01 2.19E-01 3.26E-03 2.27E-01 2.10E-01 2.19E-01 3.21E-03 2.28E-01 2.10E-01 2.18E-01 3.46E-03 2.28E-01 2.09E-01 2.14E-01 2.14E-01 2.16E-01 2.16E-01 2.17E-01 2.17E-01 2.17E-01 1.75E-03 1.65E-03 1.83E-03 1.58E-03 1.76E-03 1.73E-03 1.92E-03 2.18E-01 2.19E-01 2.21E-01 2.21E-01 2.21E-01 2.22E-01 2.22E-01 2.09E-01 2.10E-01 2.11E-01 2.12E-01 2.12E-01 2.12E-01 2.11E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 101 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.48. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 102 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.48. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.21E-01 2.19E-01 2.13E-01 2.20E-01 2.14E-01 2.17E-01 2.16E-01 2.13E-01 2.17E-01 2.16E-01 2.15E-01 2.15E-01 10 2.22E-01 2.20E-01 2.15E-01 2.21E-01 2.15E-01 2.18E-01 2.16E-01 2.14E-01 2.18E-01 2.17E-01 2.16E-01 2.16E-01 20 2.22E-01 2.21E-01 2.16E-01 2.22E-01 2.16E-01 2.19E-01 2.18E-01 2.15E-01 2.19E-01 2.18E-01 2.17E-01 2.17E-01 30 2.24E-01 2.23E-01 2.17E-01 2.23E-01 2.17E-01 2.21E-01 2.19E-01 2.16E-01 2.20E-01 2.19E-01 2.18E-01 2.18E-01 50 2.24E-01 2.22E-01 2.17E-01 2.23E-01 2.18E-01 2.20E-01 2.19E-01 2.16E-01 2.20E-01 2.18E-01 2.18E-01 2.18E-01 60 2.24E-01 2.22E-01 2.17E-01 2.23E-01 2.18E-01 2.21E-01 2.19E-01 2.16E-01 2.20E-01 2.19E-01 2.18E-01 2.18E-01 70 2.24E-01 2.22E-01 2.17E-01 2.23E-01 2.18E-01 2.21E-01 2.19E-01 2.16E-01 2.20E-01 2.19E-01 2.18E-01 2.18E-01 2.17E-01 3.29E-03 2.26E-01 2.08E-01 2.19E-01 3.31E-03 2.28E-01 2.10E-01 2.20E-01 3.09E-03 2.28E-01 2.11E-01 2.21E-01 3.42E-03 2.30E-01 2.12E-01 2.21E-01 3.27E-03 2.30E-01 2.12E-01 2.21E-01 3.16E-03 2.30E-01 2.12E-01 2.21E-01 3.25E-03 2.30E-01 2.12E-01 2.16E-01 2.17E-01 2.18E-01 2.19E-01 2.19E-01 2.19E-01 2.19E-01 1.47E-03 1.46E-03 1.56E-03 1.56E-03 1.65E-03 1.67E-03 1.66E-03 2.20E-01 2.21E-01 2.22E-01 2.23E-01 2.23E-01 2.24E-01 2.23E-01 2.12E-01 2.13E-01 2.14E-01 2.14E-01 2.14E-01 2.14E-01 2.14E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 5.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 103 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ +/- 15 V #1 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.49. Plot of Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 104 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.49. Raw data for Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ +/- 15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.89E-02 -4.17E-02 -3.28E-02 -3.82E-02 -3.77E-02 -3.66E-02 -3.66E-02 -3.85E-02 -4.07E-02 -3.71E-02 -3.98E-02 -3.68E-02 10 -3.83E-02 -4.10E-02 -3.22E-02 -3.75E-02 -3.70E-02 -3.61E-02 -3.62E-02 -3.80E-02 -4.03E-02 -3.67E-02 -3.99E-02 -3.69E-02 20 -3.81E-02 -4.07E-02 -3.22E-02 -3.73E-02 -3.68E-02 -3.60E-02 -3.62E-02 -3.79E-02 -4.04E-02 -3.65E-02 -4.03E-02 -3.73E-02 30 -3.82E-02 -4.09E-02 -3.22E-02 -3.74E-02 -3.68E-02 -3.60E-02 -3.62E-02 -3.78E-02 -4.03E-02 -3.65E-02 -4.06E-02 -3.76E-02 50 -3.76E-02 -4.03E-02 -3.17E-02 -3.69E-02 -3.63E-02 -3.55E-02 -3.57E-02 -3.71E-02 -3.98E-02 -3.58E-02 -4.06E-02 -3.76E-02 60 -3.75E-02 -4.03E-02 -3.17E-02 -3.69E-02 -3.63E-02 -3.55E-02 -3.58E-02 -3.72E-02 -3.99E-02 -3.59E-02 -4.06E-02 -3.77E-02 70 -3.80E-02 -4.06E-02 -3.20E-02 -3.73E-02 -3.65E-02 -3.62E-02 -3.65E-02 -3.81E-02 -4.05E-02 -3.68E-02 -4.07E-02 -3.77E-02 -3.78E-02 3.23E-03 -2.90E-02 -4.67E-02 -3.72E-02 3.20E-03 -2.85E-02 -4.60E-02 -3.70E-02 3.11E-03 -2.85E-02 -4.55E-02 -3.71E-02 3.14E-03 -2.85E-02 -4.57E-02 -3.65E-02 3.10E-03 -2.81E-02 -4.50E-02 -3.65E-02 3.10E-03 -2.80E-02 -4.50E-02 -3.69E-02 3.10E-03 -2.84E-02 -4.54E-02 -3.79E-02 -3.75E-02 -3.74E-02 -3.73E-02 -3.68E-02 -3.68E-02 -3.76E-02 1.74E-03 1.74E-03 1.83E-03 1.77E-03 1.81E-03 1.81E-03 1.75E-03 -3.31E-02 -3.27E-02 -3.24E-02 -3.25E-02 -3.18E-02 -3.19E-02 -3.28E-02 -4.27E-02 -4.22E-02 -4.24E-02 -4.22E-02 -4.17E-02 -4.18E-02 -4.24E-02 -1.50E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 105 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ +/- 15 V #2 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 -4.50E-02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.50. Plot of Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 106 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.50. Raw data for Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ +/- 15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.98E-02 -4.33E-02 -3.44E-02 -4.02E-02 -3.84E-02 -3.67E-02 -3.78E-02 -4.12E-02 -4.09E-02 -3.88E-02 -4.01E-02 -3.82E-02 10 -3.92E-02 -4.26E-02 -3.38E-02 -3.95E-02 -3.77E-02 -3.62E-02 -3.74E-02 -4.07E-02 -4.05E-02 -3.83E-02 -4.03E-02 -3.83E-02 20 -3.89E-02 -4.22E-02 -3.37E-02 -3.93E-02 -3.76E-02 -3.62E-02 -3.73E-02 -4.05E-02 -4.06E-02 -3.82E-02 -4.07E-02 -3.87E-02 30 -3.91E-02 -4.24E-02 -3.38E-02 -3.93E-02 -3.76E-02 -3.62E-02 -3.73E-02 -4.04E-02 -4.05E-02 -3.81E-02 -4.09E-02 -3.90E-02 50 -3.84E-02 -4.17E-02 -3.33E-02 -3.88E-02 -3.70E-02 -3.56E-02 -3.68E-02 -3.97E-02 -4.00E-02 -3.74E-02 -4.10E-02 -3.90E-02 60 -3.84E-02 -4.17E-02 -3.32E-02 -3.88E-02 -3.70E-02 -3.56E-02 -3.69E-02 -3.98E-02 -4.01E-02 -3.75E-02 -4.09E-02 -3.91E-02 70 -3.88E-02 -4.21E-02 -3.36E-02 -3.92E-02 -3.73E-02 -3.64E-02 -3.76E-02 -4.08E-02 -4.07E-02 -3.84E-02 -4.10E-02 -3.91E-02 -3.92E-02 3.23E-03 -3.04E-02 -4.81E-02 -3.85E-02 3.19E-03 -2.98E-02 -4.73E-02 -3.83E-02 3.10E-03 -2.99E-02 -4.68E-02 -3.84E-02 3.13E-03 -2.99E-02 -4.70E-02 -3.78E-02 3.09E-03 -2.93E-02 -4.63E-02 -3.78E-02 3.09E-03 -2.93E-02 -4.63E-02 -3.82E-02 3.09E-03 -2.97E-02 -4.66E-02 -3.91E-02 -3.86E-02 -3.85E-02 -3.85E-02 -3.79E-02 -3.80E-02 -3.88E-02 1.96E-03 1.95E-03 1.97E-03 1.91E-03 1.90E-03 1.91E-03 1.94E-03 -3.37E-02 -3.33E-02 -3.31E-02 -3.33E-02 -3.27E-02 -3.27E-02 -3.34E-02 -4.45E-02 -4.40E-02 -4.39E-02 -4.37E-02 -4.31E-02 -4.32E-02 -4.41E-02 -1.50E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 -1.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 107 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Short-Circuit Current @ +/- 15 V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.51. Plot of Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.51. Raw data for Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ +/- 15 V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 5.41E-02 5.49E-02 5.80E-02 5.38E-02 5.79E-02 5.70E-02 5.63E-02 5.73E-02 5.59E-02 5.75E-02 5.77E-02 5.79E-02 10 5.34E-02 5.42E-02 5.74E-02 5.32E-02 5.73E-02 5.66E-02 5.58E-02 5.67E-02 5.56E-02 5.70E-02 5.75E-02 5.78E-02 20 5.30E-02 5.38E-02 5.67E-02 5.27E-02 5.66E-02 5.60E-02 5.53E-02 5.62E-02 5.47E-02 5.65E-02 5.69E-02 5.72E-02 30 5.23E-02 5.31E-02 5.62E-02 5.21E-02 5.61E-02 5.55E-02 5.48E-02 5.57E-02 5.45E-02 5.60E-02 5.66E-02 5.68E-02 50 5.23E-02 5.31E-02 5.60E-02 5.20E-02 5.59E-02 5.54E-02 5.46E-02 5.55E-02 5.43E-02 5.59E-02 5.65E-02 5.68E-02 60 5.23E-02 5.31E-02 5.60E-02 5.20E-02 5.59E-02 5.54E-02 5.46E-02 5.55E-02 5.43E-02 5.58E-02 5.65E-02 5.67E-02 70 5.23E-02 5.32E-02 5.61E-02 5.20E-02 5.60E-02 5.55E-02 5.47E-02 5.56E-02 5.44E-02 5.59E-02 5.64E-02 5.67E-02 5.57E-02 2.05E-03 6.13E-02 5.01E-02 5.51E-02 2.09E-03 6.08E-02 4.94E-02 5.46E-02 1.95E-03 5.99E-02 4.92E-02 5.40E-02 2.02E-03 5.95E-02 4.84E-02 5.39E-02 1.98E-03 5.93E-02 4.84E-02 5.39E-02 1.96E-03 5.93E-02 4.85E-02 5.39E-02 2.00E-03 5.94E-02 4.84E-02 5.68E-02 5.63E-02 5.58E-02 5.53E-02 5.51E-02 5.51E-02 5.52E-02 6.75E-04 6.16E-04 7.14E-04 6.36E-04 6.60E-04 6.40E-04 6.46E-04 5.86E-02 5.80E-02 5.77E-02 5.70E-02 5.70E-02 5.69E-02 5.70E-02 5.49E-02 5.46E-02 5.38E-02 5.35E-02 5.33E-02 5.34E-02 5.34E-02 1.50E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 109 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Short-Circuit Current @ +/- 15 V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.52. Plot of Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 110 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.52. Raw data for Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ +/- 15 V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 5.21E-02 5.24E-02 5.54E-02 5.18E-02 5.56E-02 5.50E-02 5.40E-02 5.52E-02 5.38E-02 5.50E-02 5.55E-02 5.57E-02 10 5.14E-02 5.18E-02 5.48E-02 5.12E-02 5.50E-02 5.46E-02 5.36E-02 5.47E-02 5.34E-02 5.45E-02 5.53E-02 5.55E-02 20 5.10E-02 5.14E-02 5.42E-02 5.08E-02 5.43E-02 5.40E-02 5.31E-02 5.42E-02 5.27E-02 5.40E-02 5.47E-02 5.50E-02 30 5.04E-02 5.07E-02 5.36E-02 5.02E-02 5.38E-02 5.36E-02 5.27E-02 5.38E-02 5.24E-02 5.35E-02 5.44E-02 5.46E-02 50 5.03E-02 5.08E-02 5.35E-02 5.00E-02 5.37E-02 5.34E-02 5.25E-02 5.35E-02 5.22E-02 5.34E-02 5.44E-02 5.47E-02 60 5.04E-02 5.08E-02 5.35E-02 5.00E-02 5.37E-02 5.35E-02 5.25E-02 5.35E-02 5.22E-02 5.33E-02 5.43E-02 5.45E-02 70 5.03E-02 5.08E-02 5.36E-02 5.01E-02 5.37E-02 5.35E-02 5.25E-02 5.37E-02 5.23E-02 5.34E-02 5.43E-02 5.45E-02 5.34E-02 1.87E-03 5.86E-02 4.83E-02 5.28E-02 1.87E-03 5.80E-02 4.77E-02 5.24E-02 1.78E-03 5.72E-02 4.75E-02 5.17E-02 1.81E-03 5.67E-02 4.68E-02 5.16E-02 1.79E-03 5.66E-02 4.67E-02 5.17E-02 1.78E-03 5.65E-02 4.68E-02 5.17E-02 1.80E-03 5.66E-02 4.68E-02 5.46E-02 5.42E-02 5.36E-02 5.32E-02 5.30E-02 5.30E-02 5.31E-02 6.42E-04 6.12E-04 6.78E-04 6.04E-04 6.10E-04 6.17E-04 6.33E-04 5.64E-02 5.58E-02 5.55E-02 5.48E-02 5.47E-02 5.47E-02 5.48E-02 5.28E-02 5.25E-02 5.17E-02 5.15E-02 5.13E-02 5.13E-02 5.14E-02 1.50E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 1.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 111 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 4.50E-03 Positive Supply Current @ 5V (A) 4.40E-03 4.30E-03 4.20E-03 4.10E-03 4.00E-03 3.90E-03 3.80E-03 3.70E-03 3.60E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.53. Plot of Positive Supply Current @ 5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 112 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.53. Raw data for Positive Supply Current @ 5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @ 5V (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.85E-03 3.66E-03 3.75E-03 3.79E-03 3.90E-03 3.74E-03 3.70E-03 3.81E-03 3.76E-03 3.75E-03 3.75E-03 3.71E-03 10 3.83E-03 3.64E-03 3.73E-03 3.77E-03 3.87E-03 3.73E-03 3.69E-03 3.81E-03 3.75E-03 3.74E-03 3.76E-03 3.72E-03 20 3.82E-03 3.63E-03 3.72E-03 3.76E-03 3.85E-03 3.73E-03 3.69E-03 3.80E-03 3.75E-03 3.74E-03 3.76E-03 3.73E-03 30 3.82E-03 3.63E-03 3.73E-03 3.76E-03 3.86E-03 3.75E-03 3.70E-03 3.81E-03 3.76E-03 3.75E-03 3.78E-03 3.75E-03 50 3.78E-03 3.59E-03 3.70E-03 3.73E-03 3.82E-03 3.73E-03 3.69E-03 3.79E-03 3.75E-03 3.72E-03 3.77E-03 3.74E-03 60 3.79E-03 3.60E-03 3.70E-03 3.74E-03 3.82E-03 3.73E-03 3.69E-03 3.79E-03 3.76E-03 3.72E-03 3.77E-03 3.74E-03 70 3.80E-03 3.61E-03 3.71E-03 3.75E-03 3.83E-03 3.73E-03 3.70E-03 3.81E-03 3.75E-03 3.74E-03 3.78E-03 3.74E-03 3.79E-03 9.25E-05 4.04E-03 3.54E-03 3.77E-03 8.96E-05 4.01E-03 3.52E-03 3.76E-03 8.68E-05 3.99E-03 3.52E-03 3.76E-03 8.86E-05 4.00E-03 3.52E-03 3.72E-03 8.79E-05 3.97E-03 3.48E-03 3.73E-03 8.60E-05 3.97E-03 3.49E-03 3.74E-03 8.60E-05 3.98E-03 3.50E-03 3.75E-03 3.74E-03 3.74E-03 3.75E-03 3.74E-03 3.74E-03 3.75E-03 3.96E-05 4.34E-05 3.96E-05 3.91E-05 3.71E-05 3.83E-05 4.04E-05 3.86E-03 3.86E-03 3.85E-03 3.86E-03 3.84E-03 3.84E-03 3.86E-03 3.64E-03 3.63E-03 3.63E-03 3.65E-03 3.63E-03 3.63E-03 3.64E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03 4.40E-03 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 113 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased -3.60E-03 Negative Supply Current @ 5V (A) -3.70E-03 -3.80E-03 -3.90E-03 -4.00E-03 -4.10E-03 -4.20E-03 -4.30E-03 -4.40E-03 -4.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.54. Plot of Negative Supply Current @ 5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 114 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.54. Raw data for Negative Supply Current @ 5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @ 5V (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 -3.84E-03 -3.65E-03 -3.74E-03 -3.79E-03 -3.89E-03 -3.73E-03 -3.69E-03 -3.81E-03 -3.75E-03 -3.74E-03 -3.74E-03 -3.71E-03 10 -3.82E-03 -3.63E-03 -3.72E-03 -3.76E-03 -3.86E-03 -3.73E-03 -3.68E-03 -3.80E-03 -3.74E-03 -3.74E-03 -3.75E-03 -3.72E-03 20 -3.81E-03 -3.62E-03 -3.71E-03 -3.75E-03 -3.85E-03 -3.72E-03 -3.68E-03 -3.80E-03 -3.74E-03 -3.73E-03 -3.76E-03 -3.72E-03 30 -3.81E-03 -3.62E-03 -3.72E-03 -3.75E-03 -3.85E-03 -3.74E-03 -3.70E-03 -3.80E-03 -3.75E-03 -3.74E-03 -3.77E-03 -3.74E-03 50 -3.77E-03 -3.58E-03 -3.69E-03 -3.72E-03 -3.81E-03 -3.72E-03 -3.68E-03 -3.78E-03 -3.75E-03 -3.71E-03 -3.77E-03 -3.73E-03 60 -3.78E-03 -3.59E-03 -3.69E-03 -3.72E-03 -3.82E-03 -3.72E-03 -3.68E-03 -3.78E-03 -3.74E-03 -3.72E-03 -3.77E-03 -3.73E-03 70 -3.79E-03 -3.60E-03 -3.70E-03 -3.74E-03 -3.82E-03 -3.72E-03 -3.69E-03 -3.80E-03 -3.74E-03 -3.73E-03 -3.77E-03 -3.74E-03 -3.78E-03 9.26E-05 -3.53E-03 -4.04E-03 -3.76E-03 8.96E-05 -3.51E-03 -4.00E-03 -3.75E-03 8.96E-05 -3.50E-03 -3.99E-03 -3.75E-03 8.86E-05 -3.51E-03 -3.99E-03 -3.71E-03 8.79E-05 -3.47E-03 -3.96E-03 -3.72E-03 8.86E-05 -3.48E-03 -3.96E-03 -3.73E-03 8.60E-05 -3.49E-03 -3.97E-03 -3.74E-03 -3.74E-03 -3.73E-03 -3.75E-03 -3.73E-03 -3.73E-03 -3.74E-03 4.34E-05 4.27E-05 4.34E-05 3.58E-05 3.83E-05 3.63E-05 4.04E-05 -3.63E-03 -3.62E-03 -3.62E-03 -3.65E-03 -3.62E-03 -3.63E-03 -3.63E-03 -3.86E-03 -3.85E-03 -3.85E-03 -3.84E-03 -3.83E-03 -3.83E-03 -3.85E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 -4.40E-03 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 115 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 5V, VCM=0V #1 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.55. Plot of Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 116 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.55. Raw data for Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=0V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.56E-04 2.51E-04 1.20E-04 9.15E-05 -1.29E-04 -2.11E-05 3.42E-05 1.26E-04 -1.33E-04 2.23E-04 -5.86E-05 -3.13E-04 10 1.38E-04 2.16E-04 9.91E-05 6.02E-05 -1.57E-04 -2.96E-05 1.81E-05 1.06E-04 -1.46E-04 2.14E-04 -5.99E-05 -3.12E-04 20 1.50E-04 2.27E-04 1.06E-04 6.86E-05 -1.47E-04 -2.75E-05 1.63E-05 1.10E-04 -1.44E-04 2.21E-04 -5.89E-05 -3.11E-04 30 1.56E-04 2.31E-04 1.22E-04 7.32E-05 -1.40E-04 -2.05E-05 1.61E-05 1.15E-04 -1.43E-04 2.26E-04 -5.49E-05 -3.11E-04 50 1.54E-04 2.30E-04 1.26E-04 7.24E-05 -1.52E-04 -2.36E-05 1.56E-05 1.09E-04 -1.44E-04 2.29E-04 -5.54E-05 -3.14E-04 60 1.55E-04 2.31E-04 1.25E-04 7.35E-05 -1.51E-04 -2.45E-05 1.64E-05 1.09E-04 -1.45E-04 2.30E-04 -5.69E-05 -3.14E-04 70 1.81E-04 2.11E-04 9.84E-05 6.39E-05 -1.45E-04 -1.80E-05 2.00E-05 8.57E-05 -1.56E-04 1.98E-04 -5.64E-05 -3.14E-04 9.80E-05 1.40E-04 4.83E-04 -2.87E-04 7.13E-05 1.40E-04 4.55E-04 -3.12E-04 8.10E-05 1.40E-04 4.66E-04 -3.04E-04 8.86E-05 1.40E-04 4.73E-04 -2.96E-04 8.59E-05 1.45E-04 4.83E-04 -3.12E-04 8.68E-05 1.45E-04 4.84E-04 -3.10E-04 8.17E-05 1.40E-04 4.66E-04 -3.03E-04 4.58E-05 3.25E-05 3.51E-05 3.87E-05 3.73E-05 3.70E-05 2.59E-05 1.37E-04 1.36E-04 1.38E-04 1.40E-04 1.40E-04 1.41E-04 1.31E-04 4.20E-04 4.06E-04 4.14E-04 4.22E-04 4.22E-04 4.24E-04 3.85E-04 -3.29E-04 -3.41E-04 -3.44E-04 -3.45E-04 -3.48E-04 -3.50E-04 -3.33E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 117 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 5V, VCM=0V #2 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.56. Plot of Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 118 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.56. Raw data for Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=0V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.58E-04 -2.38E-04 1.91E-04 -5.01E-05 -2.61E-04 7.75E-05 1.05E-04 -2.07E-04 -1.41E-04 1.98E-04 1.32E-06 2.59E-04 10 1.34E-04 -2.56E-04 1.49E-04 -7.93E-05 -2.79E-04 6.81E-05 9.07E-05 -2.05E-04 -1.55E-04 1.88E-04 7.20E-07 2.72E-04 20 1.41E-04 -2.49E-04 1.53E-04 -7.11E-05 -2.56E-04 6.92E-05 9.22E-05 -1.74E-04 -1.54E-04 1.92E-04 1.92E-06 2.72E-04 30 1.44E-04 -2.47E-04 1.56E-04 -6.75E-05 -2.59E-04 7.07E-05 9.63E-05 -1.46E-04 -1.51E-04 1.96E-04 2.53E-06 2.65E-04 50 1.41E-04 -2.44E-04 1.49E-04 -6.41E-05 -2.56E-04 7.23E-05 9.18E-05 -9.67E-05 -1.57E-04 1.97E-04 1.68E-06 2.64E-04 60 1.43E-04 -2.43E-04 1.52E-04 -6.39E-05 -2.57E-04 7.39E-05 9.04E-05 -1.03E-04 -1.56E-04 1.96E-04 1.93E-06 2.64E-04 70 1.29E-04 -2.61E-04 1.17E-04 -5.00E-05 -2.71E-04 4.85E-05 8.48E-05 -2.03E-04 -1.55E-04 1.59E-04 1.92E-06 2.65E-04 -4.02E-05 2.12E-04 5.42E-04 -6.23E-04 -6.63E-05 2.05E-04 4.95E-04 -6.28E-04 -5.65E-05 2.00E-04 4.92E-04 -6.05E-04 -5.48E-05 2.02E-04 4.99E-04 -6.08E-04 -5.47E-05 1.98E-04 4.87E-04 -5.97E-04 -5.38E-05 1.99E-04 4.92E-04 -5.99E-04 -6.71E-05 1.95E-04 4.67E-04 -6.02E-04 6.49E-06 -2.80E-06 4.99E-06 1.31E-05 2.14E-05 2.03E-05 -1.30E-05 1.72E-04 1.69E-04 1.61E-04 1.55E-04 1.45E-04 1.46E-04 1.58E-04 4.79E-04 4.61E-04 4.47E-04 4.38E-04 4.19E-04 4.20E-04 4.19E-04 -4.66E-04 -4.66E-04 -4.37E-04 -4.11E-04 -3.76E-04 -3.79E-04 -4.45E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 119 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 5V, VCM=0V #1 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.57. Plot of Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 120 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.57. Raw data for Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=0V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 6.94E-09 -2.98E-09 7.49E-09 -1.51E-09 8.60E-10 1.53E-08 -3.63E-10 2.07E-09 1.58E-09 3.10E-09 9.11E-10 -9.36E-09 10 7.24E-09 -3.61E-09 7.08E-09 -2.05E-09 8.03E-10 1.52E-08 -1.33E-09 2.68E-09 1.86E-09 2.78E-09 8.75E-10 -9.25E-09 20 7.20E-09 -3.20E-09 7.28E-09 -1.53E-09 2.31E-10 1.48E-08 -1.33E-09 2.71E-09 2.13E-09 2.98E-09 9.02E-10 -9.18E-09 30 6.94E-09 -3.27E-09 7.22E-09 -1.55E-09 1.16E-10 1.41E-08 -1.75E-09 3.20E-09 2.36E-09 2.72E-09 8.15E-10 -8.84E-09 50 6.76E-09 -3.10E-09 7.70E-09 -1.85E-09 1.20E-10 1.34E-08 -2.55E-09 3.56E-09 2.81E-09 3.60E-09 8.28E-10 -9.04E-09 60 6.89E-09 -3.06E-09 7.80E-09 -2.30E-09 3.78E-10 1.36E-08 -2.03E-09 4.03E-09 2.49E-09 3.28E-09 8.81E-10 -9.01E-09 70 7.14E-09 -3.48E-09 7.03E-09 -1.25E-09 9.27E-10 1.39E-08 -9.56E-10 2.40E-09 2.29E-09 3.33E-09 8.49E-10 -8.94E-09 2.16E-09 4.82E-09 1.54E-08 -1.10E-08 1.89E-09 5.06E-09 1.58E-08 -1.20E-08 2.00E-09 4.94E-09 1.55E-08 -1.15E-08 1.89E-09 4.88E-09 1.53E-08 -1.15E-08 1.93E-09 4.99E-09 1.56E-08 -1.17E-08 1.94E-09 5.11E-09 1.59E-08 -1.21E-08 2.07E-09 4.83E-09 1.53E-08 -1.12E-08 4.34E-09 4.23E-09 4.25E-09 4.13E-09 4.16E-09 4.27E-09 4.20E-09 6.27E-09 6.34E-09 6.13E-09 5.92E-09 5.77E-09 5.72E-09 5.68E-09 2.15E-08 2.16E-08 2.10E-08 2.04E-08 2.00E-08 1.99E-08 1.98E-08 -1.29E-08 -1.32E-08 -1.25E-08 -1.21E-08 -1.16E-08 -1.14E-08 -1.14E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 PASS PASS PASS PASS PASS PASS PASS 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 121 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 5V, VCM=0V #2 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.58. Plot of Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 122 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.58. Raw data for Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=0V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.00E-12 4.88E-09 3.12E-10 3.38E-09 -1.15E-09 3.46E-09 -3.15E-09 5.01E-09 -9.44E-09 3.29E-09 -1.21E-10 7.39E-10 10 -7.00E-12 5.13E-09 8.00E-12 3.29E-09 -1.45E-09 3.31E-09 -3.65E-09 5.49E-09 -9.23E-09 4.37E-09 -1.36E-10 8.13E-10 20 -4.72E-10 5.31E-09 -2.61E-10 3.55E-09 -8.37E-10 3.89E-09 -3.53E-09 5.05E-09 -9.07E-09 5.25E-09 -8.70E-11 9.11E-10 30 2.03E-10 4.89E-09 -5.95E-10 3.39E-09 -1.29E-09 3.93E-09 -3.22E-09 4.50E-09 -8.53E-09 5.30E-09 -1.70E-10 7.21E-10 50 -1.24E-09 4.70E-09 -1.42E-09 3.83E-09 -1.45E-09 5.08E-09 -2.80E-09 5.47E-09 -8.14E-09 6.88E-09 -1.54E-10 7.51E-10 60 -1.07E-09 4.96E-09 -1.20E-09 3.65E-09 -1.30E-09 4.60E-09 -3.04E-09 5.18E-09 -8.50E-09 6.51E-09 -1.06E-10 7.67E-10 70 1.46E-10 5.09E-09 -5.77E-10 3.96E-09 -1.15E-09 3.97E-09 -2.62E-09 4.48E-09 -8.99E-09 5.24E-09 -1.36E-10 7.92E-10 1.49E-09 2.53E-09 8.43E-09 -5.46E-09 1.39E-09 2.72E-09 8.84E-09 -6.06E-09 1.46E-09 2.79E-09 9.11E-09 -6.20E-09 1.32E-09 2.68E-09 8.67E-09 -6.03E-09 8.81E-10 3.10E-09 9.39E-09 -7.63E-09 1.01E-09 3.05E-09 9.36E-09 -7.35E-09 1.49E-09 2.83E-09 9.26E-09 -6.27E-09 -1.64E-10 5.66E-11 3.18E-10 3.94E-10 1.30E-09 9.50E-10 4.16E-10 6.06E-09 6.30E-09 6.37E-09 6.04E-09 6.49E-09 6.47E-09 6.13E-09 1.64E-08 1.73E-08 1.78E-08 1.70E-08 1.91E-08 1.87E-08 1.72E-08 -1.68E-08 -1.72E-08 -1.72E-08 -1.62E-08 -1.65E-08 -1.68E-08 -1.64E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 PASS PASS PASS PASS PASS PASS PASS 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 123 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=0V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.59. Plot of Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 124 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.59. Raw data for Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=0V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.30E-07 -3.06E-07 -3.44E-07 -3.54E-07 -3.50E-07 -3.09E-07 -3.32E-07 -3.47E-07 -3.23E-07 -3.35E-07 -3.06E-07 -3.29E-07 10 -3.35E-07 -3.11E-07 -3.49E-07 -3.61E-07 -3.54E-07 -3.23E-07 -3.47E-07 -3.59E-07 -3.35E-07 -3.52E-07 -3.05E-07 -3.27E-07 20 -3.38E-07 -3.14E-07 -3.53E-07 -3.63E-07 -3.61E-07 -3.31E-07 -3.56E-07 -3.69E-07 -3.46E-07 -3.62E-07 -3.04E-07 -3.27E-07 30 -3.39E-07 -3.14E-07 -3.53E-07 -3.66E-07 -3.61E-07 -3.35E-07 -3.60E-07 -3.73E-07 -3.50E-07 -3.68E-07 -3.02E-07 -3.24E-07 50 -3.50E-07 -3.21E-07 -3.59E-07 -3.74E-07 -3.68E-07 -3.53E-07 -3.76E-07 -3.89E-07 -3.64E-07 -3.83E-07 -3.03E-07 -3.25E-07 60 -3.48E-07 -3.21E-07 -3.57E-07 -3.73E-07 -3.67E-07 -3.50E-07 -3.72E-07 -3.89E-07 -3.62E-07 -3.83E-07 -3.03E-07 -3.25E-07 70 -3.40E-07 -3.16E-07 -3.52E-07 -3.66E-07 -3.60E-07 -3.27E-07 -3.50E-07 -3.62E-07 -3.39E-07 -3.57E-07 -3.02E-07 -3.24E-07 -3.37E-07 1.95E-08 -2.83E-07 -3.90E-07 -3.42E-07 1.95E-08 -2.88E-07 -3.95E-07 -3.46E-07 2.05E-08 -2.89E-07 -4.02E-07 -3.47E-07 2.07E-08 -2.90E-07 -4.04E-07 -3.55E-07 2.07E-08 -2.98E-07 -4.11E-07 -3.53E-07 2.07E-08 -2.96E-07 -4.10E-07 -3.47E-07 1.97E-08 -2.93E-07 -4.01E-07 -3.29E-07 -3.43E-07 -3.53E-07 -3.57E-07 -3.73E-07 -3.71E-07 -3.47E-07 1.41E-08 1.43E-08 1.48E-08 1.51E-08 1.46E-08 1.56E-08 1.40E-08 -2.90E-07 -3.04E-07 -3.12E-07 -3.16E-07 -3.33E-07 -3.29E-07 -3.09E-07 -3.68E-07 -3.82E-07 -3.93E-07 -3.99E-07 -4.13E-07 -4.14E-07 -3.85E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 125 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=0V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.60. Plot of Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 126 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.60. Raw data for Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=0V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.30E-07 -2.94E-07 -3.38E-07 -3.54E-07 -3.49E-07 -3.06E-07 -3.35E-07 -3.40E-07 -3.33E-07 -3.33E-07 -3.16E-07 -3.22E-07 10 -3.35E-07 -2.99E-07 -3.45E-07 -3.59E-07 -3.55E-07 -3.19E-07 -3.49E-07 -3.53E-07 -3.48E-07 -3.49E-07 -3.15E-07 -3.21E-07 20 -3.38E-07 -3.01E-07 -3.49E-07 -3.61E-07 -3.58E-07 -3.27E-07 -3.58E-07 -3.67E-07 -3.55E-07 -3.58E-07 -3.14E-07 -3.20E-07 30 -3.40E-07 -3.03E-07 -3.51E-07 -3.64E-07 -3.61E-07 -3.31E-07 -3.62E-07 -3.76E-07 -3.58E-07 -3.65E-07 -3.12E-07 -3.18E-07 50 -3.52E-07 -3.10E-07 -3.57E-07 -3.72E-07 -3.67E-07 -3.47E-07 -3.74E-07 -3.97E-07 -3.73E-07 -3.78E-07 -3.13E-07 -3.19E-07 60 -3.49E-07 -3.09E-07 -3.55E-07 -3.71E-07 -3.68E-07 -3.46E-07 -3.72E-07 -3.95E-07 -3.72E-07 -3.77E-07 -3.13E-07 -3.19E-07 70 -3.41E-07 -3.03E-07 -3.49E-07 -3.64E-07 -3.60E-07 -3.23E-07 -3.52E-07 -3.63E-07 -3.51E-07 -3.53E-07 -3.12E-07 -3.18E-07 -3.33E-07 2.39E-08 -2.67E-07 -3.98E-07 -3.39E-07 2.41E-08 -2.72E-07 -4.05E-07 -3.42E-07 2.43E-08 -2.75E-07 -4.08E-07 -3.44E-07 2.46E-08 -2.76E-07 -4.11E-07 -3.52E-07 2.48E-08 -2.84E-07 -4.20E-07 -3.50E-07 2.49E-08 -2.82E-07 -4.19E-07 -3.43E-07 2.42E-08 -2.77E-07 -4.10E-07 -3.29E-07 -3.44E-07 -3.53E-07 -3.58E-07 -3.74E-07 -3.72E-07 -3.48E-07 1.33E-08 1.38E-08 1.52E-08 1.68E-08 1.79E-08 1.74E-08 1.49E-08 -2.93E-07 -3.06E-07 -3.11E-07 -3.12E-07 -3.25E-07 -3.25E-07 -3.07E-07 -3.66E-07 -3.82E-07 -3.95E-07 -4.04E-07 -4.23E-07 -4.20E-07 -3.89E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 127 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=0V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.61. Plot of Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 128 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.61. Raw data for Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=0V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.37E-07 -3.03E-07 -3.52E-07 -3.55E-07 -3.51E-07 -3.25E-07 -3.32E-07 -3.50E-07 -3.25E-07 -3.38E-07 -3.07E-07 -3.20E-07 10 -3.44E-07 -3.08E-07 -3.56E-07 -3.60E-07 -3.56E-07 -3.38E-07 -3.45E-07 -3.62E-07 -3.37E-07 -3.55E-07 -3.06E-07 -3.19E-07 20 -3.48E-07 -3.10E-07 -3.59E-07 -3.63E-07 -3.60E-07 -3.50E-07 -3.54E-07 -3.71E-07 -3.47E-07 -3.66E-07 -3.05E-07 -3.18E-07 30 -3.49E-07 -3.11E-07 -3.61E-07 -3.64E-07 -3.61E-07 -3.52E-07 -3.59E-07 -3.78E-07 -3.52E-07 -3.71E-07 -3.03E-07 -3.15E-07 50 -3.58E-07 -3.18E-07 -3.67E-07 -3.73E-07 -3.68E-07 -3.64E-07 -3.72E-07 -3.93E-07 -3.65E-07 -3.88E-07 -3.04E-07 -3.16E-07 60 -3.55E-07 -3.18E-07 -3.66E-07 -3.70E-07 -3.67E-07 -3.65E-07 -3.70E-07 -3.92E-07 -3.64E-07 -3.85E-07 -3.04E-07 -3.17E-07 70 -3.50E-07 -3.12E-07 -3.60E-07 -3.66E-07 -3.61E-07 -3.44E-07 -3.50E-07 -3.66E-07 -3.41E-07 -3.60E-07 -3.03E-07 -3.16E-07 -3.40E-07 2.16E-08 -2.81E-07 -3.99E-07 -3.45E-07 2.16E-08 -2.86E-07 -4.04E-07 -3.48E-07 2.19E-08 -2.88E-07 -4.08E-07 -3.49E-07 2.21E-08 -2.89E-07 -4.10E-07 -3.57E-07 2.22E-08 -2.96E-07 -4.18E-07 -3.55E-07 2.19E-08 -2.95E-07 -4.15E-07 -3.50E-07 2.17E-08 -2.90E-07 -4.09E-07 -3.34E-07 -3.48E-07 -3.57E-07 -3.63E-07 -3.77E-07 -3.75E-07 -3.52E-07 1.05E-08 1.09E-08 1.05E-08 1.16E-08 1.32E-08 1.27E-08 1.06E-08 -3.05E-07 -3.18E-07 -3.29E-07 -3.31E-07 -3.40E-07 -3.41E-07 -3.23E-07 -3.63E-07 -3.77E-07 -3.86E-07 -3.94E-07 -4.13E-07 -4.10E-07 -3.81E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 129 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=0V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.62. Plot of Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 130 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.62. Raw data for Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=0V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -3.30E-07 -2.99E-07 -3.38E-07 -3.59E-07 -3.48E-07 -3.10E-07 -3.32E-07 -3.47E-07 -3.24E-07 -3.37E-07 -3.16E-07 -3.23E-07 10 -3.35E-07 -3.04E-07 -3.47E-07 -3.63E-07 -3.54E-07 -3.23E-07 -3.45E-07 -3.62E-07 -3.36E-07 -3.54E-07 -3.15E-07 -3.22E-07 20 -3.38E-07 -3.07E-07 -3.50E-07 -3.66E-07 -3.59E-07 -3.31E-07 -3.53E-07 -3.75E-07 -3.49E-07 -3.63E-07 -3.14E-07 -3.21E-07 30 -3.40E-07 -3.08E-07 -3.50E-07 -3.67E-07 -3.59E-07 -3.35E-07 -3.58E-07 -3.82E-07 -3.50E-07 -3.69E-07 -3.12E-07 -3.19E-07 50 -3.51E-07 -3.15E-07 -3.56E-07 -3.74E-07 -3.67E-07 -3.51E-07 -3.72E-07 -4.02E-07 -3.65E-07 -3.85E-07 -3.13E-07 -3.20E-07 60 -3.50E-07 -3.14E-07 -3.55E-07 -3.74E-07 -3.66E-07 -3.50E-07 -3.70E-07 -4.01E-07 -3.65E-07 -3.85E-07 -3.13E-07 -3.20E-07 70 -3.44E-07 -3.09E-07 -3.49E-07 -3.69E-07 -3.58E-07 -3.27E-07 -3.51E-07 -3.70E-07 -3.40E-07 -3.58E-07 -3.12E-07 -3.19E-07 -3.35E-07 2.28E-08 -2.72E-07 -3.97E-07 -3.41E-07 2.29E-08 -2.78E-07 -4.03E-07 -3.44E-07 2.32E-08 -2.80E-07 -4.07E-07 -3.45E-07 2.31E-08 -2.81E-07 -4.08E-07 -3.53E-07 2.29E-08 -2.90E-07 -4.15E-07 -3.52E-07 2.31E-08 -2.88E-07 -4.15E-07 -3.46E-07 2.28E-08 -2.83E-07 -4.08E-07 -3.30E-07 -3.44E-07 -3.54E-07 -3.59E-07 -3.75E-07 -3.74E-07 -3.49E-07 1.39E-08 1.54E-08 1.65E-08 1.80E-08 1.95E-08 1.93E-08 1.64E-08 -2.92E-07 -3.02E-07 -3.09E-07 -3.09E-07 -3.21E-07 -3.21E-07 -3.04E-07 -3.68E-07 -3.86E-07 -4.00E-07 -4.08E-07 -4.28E-07 -4.27E-07 -3.94E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 131 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 5V, VCM=5V #1 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.63. Plot of Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 132 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.63. Raw data for Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.68E-04 2.97E-04 1.87E-04 2.41E-04 -6.05E-06 1.13E-04 4.72E-05 3.64E-04 -9.89E-05 3.01E-04 -6.41E-06 -1.27E-04 10 2.52E-04 2.69E-04 1.64E-04 2.13E-04 -3.99E-05 1.05E-04 3.36E-05 3.47E-04 -1.13E-04 3.01E-04 -7.37E-06 -1.28E-04 20 2.60E-04 2.81E-04 1.67E-04 2.18E-04 -3.29E-05 1.07E-04 3.50E-05 3.51E-04 -1.11E-04 3.08E-04 -6.41E-06 -1.28E-04 30 2.67E-04 2.86E-04 1.74E-04 2.21E-04 -2.86E-05 1.15E-04 3.51E-05 3.57E-04 -1.11E-04 3.17E-04 -3.39E-06 -1.28E-04 50 2.66E-04 2.88E-04 1.77E-04 2.18E-04 -3.67E-05 1.13E-04 3.82E-05 3.52E-04 -1.09E-04 3.23E-04 -2.30E-06 -1.29E-04 60 2.67E-04 2.89E-04 1.78E-04 2.19E-04 -3.55E-05 1.13E-04 3.80E-05 3.54E-04 -1.10E-04 3.24E-04 -2.66E-06 -1.28E-04 70 2.78E-04 2.86E-04 1.35E-04 2.36E-04 -2.67E-05 1.18E-04 4.96E-05 3.32E-04 -1.19E-04 2.85E-04 -2.78E-06 -1.27E-04 1.97E-04 1.21E-04 5.28E-04 -1.33E-04 1.72E-04 1.25E-04 5.14E-04 -1.71E-04 1.79E-04 1.26E-04 5.24E-04 -1.67E-04 1.84E-04 1.26E-04 5.31E-04 -1.63E-04 1.82E-04 1.30E-04 5.38E-04 -1.73E-04 1.83E-04 1.30E-04 5.39E-04 -1.72E-04 1.82E-04 1.31E-04 5.41E-04 -1.78E-04 1.45E-04 1.35E-04 1.38E-04 1.42E-04 1.43E-04 1.44E-04 1.33E-04 1.89E-04 1.91E-04 1.92E-04 1.95E-04 1.95E-04 1.96E-04 1.83E-04 6.63E-04 6.58E-04 6.66E-04 6.78E-04 6.78E-04 6.80E-04 6.34E-04 -3.72E-04 -3.88E-04 -3.90E-04 -3.93E-04 -3.91E-04 -3.93E-04 -3.68E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 133 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 5V, VCM=5V #2 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.64. Plot of Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 134 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.64. Raw data for Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 2.41E-04 5.77E-05 3.76E-04 -1.15E-05 -5.42E-05 2.43E-04 2.39E-04 2.14E-05 7.33E-05 3.61E-04 3.25E-04 2.75E-04 10 2.21E-04 3.79E-05 3.43E-04 -4.23E-05 -7.18E-05 2.36E-04 2.28E-04 2.23E-05 6.00E-05 3.62E-04 3.25E-04 2.86E-04 20 2.28E-04 4.64E-05 3.49E-04 -3.68E-05 -5.70E-05 2.39E-04 2.29E-04 5.03E-05 6.23E-05 3.68E-04 3.27E-04 2.86E-04 30 2.30E-04 4.91E-05 3.52E-04 -3.61E-05 -5.64E-05 2.42E-04 2.33E-04 7.42E-05 6.51E-05 3.73E-04 3.29E-04 2.79E-04 50 2.31E-04 4.97E-05 3.49E-04 -3.25E-05 -5.54E-05 2.48E-04 2.32E-04 1.16E-04 6.41E-05 3.76E-04 3.28E-04 2.77E-04 60 2.32E-04 5.06E-05 3.51E-04 -3.31E-05 -5.65E-05 2.48E-04 2.33E-04 1.13E-04 6.37E-05 3.77E-04 3.28E-04 2.77E-04 70 2.34E-04 5.66E-05 3.10E-04 -3.42E-05 -4.00E-05 2.35E-04 2.46E-04 2.49E-05 6.51E-05 3.55E-04 3.29E-04 2.79E-04 1.22E-04 1.82E-04 6.20E-04 -3.76E-04 9.75E-05 1.78E-04 5.86E-04 -3.91E-04 1.06E-04 1.76E-04 5.89E-04 -3.78E-04 1.08E-04 1.77E-04 5.93E-04 -3.78E-04 1.08E-04 1.75E-04 5.89E-04 -3.73E-04 1.09E-04 1.77E-04 5.93E-04 -3.76E-04 1.05E-04 1.59E-04 5.42E-04 -3.31E-04 1.87E-04 1.82E-04 1.90E-04 1.97E-04 2.07E-04 2.07E-04 1.85E-04 1.38E-04 1.39E-04 1.34E-04 1.29E-04 1.22E-04 1.23E-04 1.37E-04 5.67E-04 5.64E-04 5.56E-04 5.52E-04 5.42E-04 5.44E-04 5.61E-04 -1.92E-04 -2.01E-04 -1.76E-04 -1.57E-04 -1.27E-04 -1.30E-04 -1.91E-04 -8.00E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 -9.50E-04 PASS PASS PASS PASS PASS PASS PASS 8.00E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 9.50E-04 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 135 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 5V, VCM=5V #1 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.65. Plot of Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 136 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.65. Raw data for Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=5V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 4.01E-09 9.28E-10 -2.98E-09 -4.78E-09 2.07E-09 1.43E-09 5.45E-09 -8.25E-09 -4.18E-09 1.37E-08 -2.75E-09 8.50E-09 10 5.84E-09 1.72E-09 -2.55E-09 -3.66E-09 9.29E-10 3.23E-10 5.55E-09 -6.94E-09 -4.73E-09 1.99E-08 -2.72E-09 8.18E-09 20 4.40E-09 1.81E-09 -4.17E-09 -4.56E-09 -5.77E-10 1.45E-10 6.70E-09 -6.22E-09 -4.30E-09 1.87E-08 -2.70E-09 8.23E-09 30 4.31E-09 1.14E-09 -4.85E-09 -4.95E-09 -9.75E-10 2.74E-10 7.33E-09 -7.29E-09 -4.17E-09 1.92E-08 -2.68E-09 8.21E-09 50 3.78E-09 -4.03E-10 -5.09E-09 -7.67E-09 -3.60E-09 -1.00E-11 6.49E-09 -9.21E-09 -3.40E-09 1.85E-08 -2.71E-09 8.10E-09 60 3.54E-09 -1.39E-10 -4.45E-09 -7.53E-09 -2.56E-09 2.26E-10 5.77E-09 -7.83E-09 -3.33E-09 1.83E-08 -2.76E-09 8.13E-09 70 1.63E-08 1.37E-08 9.59E-09 7.70E-09 1.67E-08 6.94E-10 5.79E-09 -9.87E-09 -3.37E-09 1.57E-08 -2.66E-09 8.09E-09 -1.51E-10 3.63E-09 9.81E-09 -1.01E-08 4.55E-10 3.77E-09 1.08E-08 -9.88E-09 -6.19E-10 3.85E-09 9.93E-09 -1.12E-08 -1.06E-09 3.97E-09 9.83E-09 -1.20E-08 -2.59E-09 4.42E-09 9.54E-09 -1.47E-08 -2.23E-09 4.21E-09 9.31E-09 -1.38E-08 1.28E-08 4.00E-09 2.38E-08 1.80E-09 1.64E-09 2.82E-09 3.00E-09 3.07E-09 2.47E-09 2.63E-09 1.79E-09 8.55E-09 1.07E-08 1.01E-08 1.06E-08 1.06E-08 1.01E-08 9.66E-09 2.51E-08 3.22E-08 3.06E-08 3.20E-08 3.15E-08 3.03E-08 2.83E-08 -2.18E-08 -2.65E-08 -2.46E-08 -2.59E-08 -2.66E-08 -2.50E-08 -2.47E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 PASS PASS PASS PASS PASS PASS PASS 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 137 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 5V, VCM=5V #2 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.66. Plot of Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 138 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.66. Raw data for Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=5V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 9.86E-09 3.68E-09 1.22E-08 3.66E-09 -5.09E-09 7.48E-09 1.30E-08 -1.63E-09 1.02E-08 7.67E-10 2.08E-09 6.01E-10 10 1.05E-08 4.13E-09 1.25E-08 4.73E-09 -5.22E-09 8.18E-09 1.29E-08 1.07E-09 1.04E-08 3.87E-09 2.01E-09 6.72E-10 20 9.96E-09 3.91E-09 1.25E-08 4.35E-09 -7.21E-09 8.23E-09 1.29E-08 2.64E-09 1.01E-08 3.55E-09 2.10E-09 5.88E-10 30 9.03E-09 3.26E-09 1.23E-08 3.81E-09 -6.22E-09 8.81E-09 1.27E-08 4.34E-09 9.38E-09 2.48E-09 2.15E-09 6.02E-10 50 7.60E-09 1.49E-09 1.05E-08 3.69E-09 -8.20E-09 9.27E-09 1.32E-08 7.01E-09 9.59E-09 1.18E-09 2.05E-09 5.49E-10 60 8.10E-09 1.70E-09 1.02E-08 3.69E-09 -8.48E-09 9.01E-09 1.41E-08 6.81E-09 9.03E-09 1.50E-09 2.11E-09 5.52E-10 70 2.01E-08 1.68E-08 2.54E-08 1.52E-08 1.12E-08 7.68E-09 1.30E-08 5.27E-10 1.06E-08 2.61E-09 2.12E-09 4.96E-10 4.86E-09 6.71E-09 2.33E-08 -1.36E-08 5.33E-09 6.91E-09 2.43E-08 -1.36E-08 4.69E-09 7.59E-09 2.55E-08 -1.61E-08 4.44E-09 7.04E-09 2.37E-08 -1.49E-08 3.02E-09 7.18E-09 2.27E-08 -1.67E-08 3.03E-09 7.26E-09 2.29E-08 -1.69E-08 1.77E-08 5.34E-09 3.24E-08 3.11E-09 5.96E-09 7.28E-09 7.46E-09 7.55E-09 8.06E-09 8.08E-09 6.89E-09 6.21E-09 4.81E-09 4.33E-09 4.11E-09 4.45E-09 4.54E-09 5.26E-09 2.30E-08 2.05E-08 1.93E-08 1.88E-08 2.03E-08 2.05E-08 2.13E-08 -1.11E-08 -5.90E-09 -4.41E-09 -3.73E-09 -4.14E-09 -4.37E-09 -7.53E-09 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 -6.50E-08 PASS PASS PASS PASS PASS PASS PASS 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 6.50E-08 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 139 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=5V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.67. Plot of Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 140 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.67. Raw data for Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=5V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.44E-07 3.11E-07 3.43E-07 3.35E-07 3.41E-07 3.22E-07 3.43E-07 3.29E-07 3.21E-07 3.41E-07 3.16E-07 3.24E-07 10 3.67E-07 3.36E-07 3.68E-07 3.53E-07 3.67E-07 3.57E-07 3.77E-07 3.72E-07 3.53E-07 3.88E-07 3.15E-07 3.23E-07 20 3.81E-07 3.51E-07 3.85E-07 3.70E-07 3.88E-07 3.83E-07 4.01E-07 4.06E-07 3.77E-07 4.20E-07 3.15E-07 3.23E-07 30 3.93E-07 3.65E-07 3.94E-07 3.82E-07 4.02E-07 4.02E-07 4.18E-07 4.29E-07 3.93E-07 4.41E-07 3.13E-07 3.22E-07 50 4.18E-07 3.92E-07 4.23E-07 4.08E-07 4.32E-07 4.37E-07 4.51E-07 4.76E-07 4.26E-07 4.87E-07 3.14E-07 3.23E-07 60 4.19E-07 3.91E-07 4.22E-07 4.06E-07 4.30E-07 4.34E-07 4.47E-07 4.71E-07 4.23E-07 4.80E-07 3.14E-07 3.23E-07 70 4.03E-07 3.75E-07 4.04E-07 3.91E-07 4.12E-07 3.86E-07 4.05E-07 4.00E-07 3.80E-07 4.14E-07 3.14E-07 3.22E-07 3.35E-07 1.36E-08 3.72E-07 2.98E-07 3.58E-07 1.39E-08 3.96E-07 3.20E-07 3.75E-07 1.50E-08 4.16E-07 3.34E-07 3.87E-07 1.43E-08 4.27E-07 3.48E-07 4.14E-07 1.55E-08 4.57E-07 3.72E-07 4.14E-07 1.55E-08 4.56E-07 3.71E-07 3.97E-07 1.43E-08 4.36E-07 3.58E-07 3.31E-07 3.69E-07 3.97E-07 4.17E-07 4.56E-07 4.51E-07 3.97E-07 1.03E-08 1.47E-08 1.77E-08 1.94E-08 2.55E-08 2.44E-08 1.38E-08 3.60E-07 4.10E-07 4.46E-07 4.70E-07 5.26E-07 5.18E-07 4.35E-07 3.03E-07 3.29E-07 3.49E-07 3.63E-07 3.86E-07 3.84E-07 3.59E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 141 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=5V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.68. Plot of Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 142 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.68. Raw data for Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=5V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.43E-07 3.03E-07 3.41E-07 3.41E-07 3.39E-07 3.28E-07 3.40E-07 3.41E-07 3.33E-07 3.27E-07 3.18E-07 3.16E-07 10 3.65E-07 3.27E-07 3.66E-07 3.65E-07 3.63E-07 3.64E-07 3.71E-07 3.93E-07 3.64E-07 3.71E-07 3.17E-07 3.15E-07 20 3.78E-07 3.42E-07 3.83E-07 3.82E-07 3.83E-07 3.89E-07 3.95E-07 4.38E-07 3.88E-07 4.02E-07 3.17E-07 3.15E-07 30 3.90E-07 3.55E-07 3.96E-07 3.92E-07 3.97E-07 4.09E-07 4.11E-07 4.69E-07 4.04E-07 4.22E-07 3.16E-07 3.13E-07 50 4.15E-07 3.83E-07 4.21E-07 4.20E-07 4.31E-07 4.45E-07 4.47E-07 5.37E-07 4.39E-07 4.64E-07 3.16E-07 3.15E-07 60 4.16E-07 3.82E-07 4.18E-07 4.18E-07 4.29E-07 4.40E-07 4.43E-07 5.28E-07 4.34E-07 4.58E-07 3.16E-07 3.14E-07 70 4.00E-07 3.68E-07 4.02E-07 4.01E-07 4.09E-07 3.90E-07 3.98E-07 4.31E-07 3.91E-07 3.97E-07 3.16E-07 3.14E-07 3.33E-07 1.72E-08 3.80E-07 2.86E-07 3.57E-07 1.71E-08 4.04E-07 3.10E-07 3.74E-07 1.78E-08 4.22E-07 3.25E-07 3.86E-07 1.78E-08 4.35E-07 3.37E-07 4.14E-07 1.81E-08 4.64E-07 3.64E-07 4.12E-07 1.78E-08 4.61E-07 3.64E-07 3.96E-07 1.63E-08 4.41E-07 3.51E-07 3.34E-07 3.73E-07 4.03E-07 4.23E-07 4.66E-07 4.61E-07 4.02E-07 6.43E-09 1.20E-08 2.04E-08 2.67E-08 4.07E-08 3.87E-08 1.71E-08 3.51E-07 4.06E-07 4.58E-07 4.96E-07 5.78E-07 5.67E-07 4.48E-07 3.16E-07 3.40E-07 3.47E-07 3.50E-07 3.55E-07 3.54E-07 3.55E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 143 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=5V #1 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.69. Plot of Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 144 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.69. Raw data for Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=5V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.39E-07 3.10E-07 3.46E-07 3.39E-07 3.39E-07 3.21E-07 3.41E-07 3.38E-07 3.25E-07 3.27E-07 3.18E-07 3.16E-07 10 3.59E-07 3.34E-07 3.70E-07 3.57E-07 3.66E-07 3.56E-07 3.71E-07 3.79E-07 3.55E-07 3.68E-07 3.18E-07 3.15E-07 20 3.76E-07 3.49E-07 3.89E-07 3.74E-07 3.88E-07 3.84E-07 3.95E-07 4.13E-07 3.81E-07 4.01E-07 3.17E-07 3.15E-07 30 3.89E-07 3.63E-07 3.99E-07 3.85E-07 4.03E-07 4.01E-07 4.09E-07 4.38E-07 3.96E-07 4.21E-07 3.16E-07 3.14E-07 50 4.15E-07 3.93E-07 4.26E-07 4.15E-07 4.36E-07 4.37E-07 4.46E-07 4.86E-07 4.29E-07 4.67E-07 3.17E-07 3.15E-07 60 4.15E-07 3.91E-07 4.25E-07 4.15E-07 4.34E-07 4.33E-07 4.42E-07 4.80E-07 4.26E-07 4.61E-07 3.17E-07 3.14E-07 70 3.87E-07 3.61E-07 3.94E-07 3.83E-07 3.95E-07 3.85E-07 3.98E-07 4.09E-07 3.83E-07 3.97E-07 3.17E-07 3.14E-07 3.35E-07 1.41E-08 3.73E-07 2.96E-07 3.57E-07 1.40E-08 3.96E-07 3.19E-07 3.75E-07 1.59E-08 4.19E-07 3.32E-07 3.88E-07 1.56E-08 4.31E-07 3.45E-07 4.17E-07 1.60E-08 4.61E-07 3.73E-07 4.16E-07 1.59E-08 4.60E-07 3.72E-07 3.84E-07 1.39E-08 4.22E-07 3.46E-07 3.30E-07 3.66E-07 3.95E-07 4.13E-07 4.53E-07 4.48E-07 3.94E-07 8.44E-09 1.02E-08 1.32E-08 1.69E-08 2.33E-08 2.19E-08 1.08E-08 3.53E-07 3.94E-07 4.31E-07 4.59E-07 5.17E-07 5.08E-07 4.24E-07 3.07E-07 3.38E-07 3.58E-07 3.67E-07 3.89E-07 3.88E-07 3.65E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 145 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=5V #2 (A) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.70. Plot of Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 146 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.70. Raw data for Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=5V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.36E-07 2.99E-07 3.31E-07 3.41E-07 3.41E-07 3.21E-07 3.27E-07 3.40E-07 3.23E-07 3.26E-07 3.16E-07 3.15E-07 10 3.53E-07 3.22E-07 3.52E-07 3.58E-07 3.69E-07 3.56E-07 3.58E-07 3.89E-07 3.53E-07 3.67E-07 3.16E-07 3.14E-07 20 3.68E-07 3.38E-07 3.71E-07 3.77E-07 3.89E-07 3.81E-07 3.82E-07 4.33E-07 3.79E-07 4.00E-07 3.15E-07 3.14E-07 30 3.81E-07 3.52E-07 3.85E-07 3.88E-07 4.05E-07 4.01E-07 3.98E-07 4.63E-07 3.94E-07 4.20E-07 3.13E-07 3.13E-07 50 4.08E-07 3.81E-07 4.11E-07 4.16E-07 4.38E-07 4.36E-07 4.34E-07 5.30E-07 4.30E-07 4.64E-07 3.14E-07 3.14E-07 60 4.06E-07 3.79E-07 4.09E-07 4.15E-07 4.36E-07 4.31E-07 4.28E-07 5.23E-07 4.24E-07 4.58E-07 3.14E-07 3.13E-07 70 3.81E-07 3.49E-07 3.76E-07 3.86E-07 3.98E-07 3.84E-07 3.85E-07 4.30E-07 3.80E-07 3.97E-07 3.14E-07 3.13E-07 3.29E-07 1.76E-08 3.78E-07 2.81E-07 3.51E-07 1.73E-08 3.98E-07 3.03E-07 3.69E-07 1.87E-08 4.20E-07 3.17E-07 3.82E-07 1.93E-08 4.35E-07 3.29E-07 4.11E-07 2.06E-08 4.67E-07 3.54E-07 4.09E-07 2.02E-08 4.64E-07 3.54E-07 3.78E-07 1.81E-08 4.28E-07 3.28E-07 3.27E-07 3.64E-07 3.95E-07 4.15E-07 4.59E-07 4.53E-07 3.95E-07 7.40E-09 1.46E-08 2.30E-08 2.87E-08 4.18E-08 4.14E-08 2.06E-08 3.47E-07 4.04E-07 4.58E-07 4.94E-07 5.73E-07 5.66E-07 4.52E-07 3.07E-07 3.24E-07 3.32E-07 3.37E-07 3.44E-07 3.39E-07 3.39E-07 -6.50E-07 -7.00E-07 -7.50E-07 -7.50E-07 -8.00E-07 -8.00E-07 -8.00E-07 PASS PASS PASS PASS PASS PASS PASS 6.50E-07 7.00E-07 7.50E-07 7.50E-07 8.00E-07 8.00E-07 8.00E-07 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 147 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #1 (V/mV) 6.00E+03 4.00E+03 2.00E+03 0.00E+00 -2.00E+03 -4.00E+03 -6.00E+03 -8.00E+03 -1.00E+04 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.71. Plot of Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 148 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.71. Raw data for Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #1 (V/mV) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 2.64E+03 2.61E+03 2.53E+03 2.47E+03 3.45E+03 2.85E+03 2.52E+03 2.79E+03 2.34E+03 2.79E+03 2.21E+03 1.45E+03 10 2.60E+03 2.54E+03 2.54E+03 2.41E+03 1.79E+03 2.76E+03 2.40E+03 3.83E+03 1.84E+03 2.43E+03 2.16E+03 2.49E+03 20 2.27E+03 2.17E+03 2.54E+03 2.18E+03 1.67E+03 2.38E+03 2.63E+03 2.32E+03 2.44E+03 1.32E+04 2.25E+03 2.58E+03 30 2.41E+03 2.15E+03 2.29E+03 2.14E+03 2.56E+03 2.30E+03 2.89E+03 3.12E+03 2.22E+03 2.25E+03 2.40E+03 2.79E+03 50 2.23E+03 2.00E+03 2.57E+03 2.31E+03 2.19E+03 2.76E+03 2.81E+03 2.61E+03 1.68E+03 2.12E+03 1.54E+03 2.78E+03 60 2.44E+03 1.84E+03 2.58E+03 2.01E+03 2.48E+03 2.52E+03 1.85E+03 2.23E+03 3.94E+03 2.67E+03 2.29E+03 2.29E+03 70 2.33E+03 1.88E+03 2.30E+03 2.32E+03 2.52E+03 2.79E+03 2.54E+03 2.27E+03 1.86E+03 2.50E+03 2.55E+03 4.43E+03 2.74E+03 4.03E+02 3.85E+03 1.63E+03 2.38E+03 3.36E+02 3.30E+03 1.46E+03 2.17E+03 3.17E+02 3.04E+03 1.30E+03 2.31E+03 1.80E+02 2.80E+03 1.82E+03 2.26E+03 2.06E+02 2.82E+03 1.69E+03 2.27E+03 3.26E+02 3.16E+03 1.38E+03 2.27E+03 2.36E+02 2.92E+03 1.62E+03 2.66E+03 2.65E+03 4.60E+03 2.56E+03 2.40E+03 2.64E+03 2.39E+03 2.20E+02 7.36E+02 4.82E+03 4.20E+02 4.82E+02 7.90E+02 3.48E+02 3.26E+03 4.67E+03 1.78E+04 3.71E+03 3.72E+03 4.81E+03 3.35E+03 2.05E+03 6.32E+02 -8.61E+03 1.41E+03 1.08E+03 4.76E+02 1.44E+03 6.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 149 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #2 (V/mV) 3.50E+03 3.00E+03 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.72. Plot of Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 150 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.72. Raw data for Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #2 (V/mV) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 2.58E+03 2.35E+03 3.15E+03 2.41E+03 2.31E+03 2.68E+03 2.56E+03 2.07E+03 3.20E+03 2.29E+03 2.43E+03 2.22E+03 10 2.32E+03 1.85E+03 2.75E+03 2.52E+03 2.36E+03 3.04E+03 2.45E+03 3.32E+03 2.85E+03 2.73E+03 2.43E+03 2.66E+03 20 2.15E+03 2.33E+03 2.86E+03 2.59E+03 1.95E+03 1.98E+03 2.05E+03 2.21E+03 2.55E+03 2.62E+03 1.79E+03 2.35E+03 30 2.06E+03 1.91E+03 2.80E+03 1.91E+03 2.26E+03 2.06E+03 2.53E+03 2.30E+03 2.72E+03 2.06E+03 1.88E+03 1.49E+03 50 2.01E+03 1.90E+03 2.67E+03 2.14E+03 2.25E+03 1.77E+03 3.24E+03 2.22E+03 3.93E+03 1.95E+03 2.37E+03 2.41E+03 60 2.01E+03 1.91E+03 2.55E+03 2.25E+03 1.93E+03 2.34E+03 2.57E+03 2.08E+03 2.52E+03 2.13E+03 2.50E+03 2.59E+03 70 2.22E+03 1.98E+03 2.41E+03 2.29E+03 1.97E+03 2.00E+03 2.23E+03 2.02E+03 2.87E+03 2.31E+03 2.26E+03 2.40E+03 2.56E+03 3.46E+02 3.51E+03 1.61E+03 2.36E+03 3.31E+02 3.26E+03 1.45E+03 2.38E+03 3.59E+02 3.36E+03 1.39E+03 2.19E+03 3.73E+02 3.21E+03 1.16E+03 2.19E+03 2.96E+02 3.01E+03 1.38E+03 2.13E+03 2.71E+02 2.87E+03 1.39E+03 2.17E+03 1.94E+02 2.70E+03 1.64E+03 2.56E+03 2.88E+03 2.28E+03 2.33E+03 2.62E+03 2.33E+03 2.29E+03 4.29E+02 3.28E+02 2.91E+02 2.88E+02 9.28E+02 2.20E+02 3.55E+02 3.73E+03 3.78E+03 3.08E+03 3.13E+03 5.17E+03 2.93E+03 3.26E+03 1.38E+03 1.98E+03 1.48E+03 1.54E+03 7.80E+01 1.72E+03 1.31E+03 6.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 3.00E+02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 151 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio @ 5V #1 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.73. Plot of Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 152 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.73. Raw data for Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 5V #1 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 9.30E+01 1.01E+02 9.73E+01 9.04E+01 9.22E+01 9.13E+01 1.12E+02 8.64E+01 1.03E+02 9.62E+01 9.95E+01 8.86E+01 10 9.29E+01 9.93E+01 9.76E+01 9.03E+01 9.27E+01 9.14E+01 1.11E+02 8.63E+01 1.03E+02 9.51E+01 9.94E+01 8.86E+01 20 9.31E+01 9.93E+01 9.82E+01 9.05E+01 9.29E+01 9.14E+01 1.09E+02 8.62E+01 1.04E+02 9.52E+01 9.95E+01 8.87E+01 30 9.31E+01 9.92E+01 9.95E+01 9.05E+01 9.31E+01 9.13E+01 1.08E+02 8.63E+01 1.03E+02 9.49E+01 9.96E+01 8.87E+01 50 9.30E+01 9.88E+01 9.94E+01 9.08E+01 9.27E+01 9.12E+01 1.07E+02 8.62E+01 1.03E+02 9.44E+01 9.94E+01 8.86E+01 60 9.30E+01 9.89E+01 9.94E+01 9.07E+01 9.28E+01 9.12E+01 1.07E+02 8.62E+01 1.03E+02 9.45E+01 9.93E+01 8.85E+01 70 9.42E+01 9.65E+01 1.03E+02 8.93E+01 9.25E+01 9.12E+01 1.05E+02 8.61E+01 1.03E+02 9.52E+01 9.93E+01 8.86E+01 9.47E+01 4.24E+00 1.06E+02 8.31E+01 9.45E+01 3.74E+00 1.05E+02 8.43E+01 9.48E+01 3.78E+00 1.05E+02 8.44E+01 9.51E+01 4.05E+00 1.06E+02 8.40E+01 9.49E+01 3.89E+00 1.06E+02 8.43E+01 9.49E+01 3.92E+00 1.06E+02 8.42E+01 9.50E+01 4.95E+00 1.09E+02 8.14E+01 9.78E+01 9.74E+01 9.70E+01 9.68E+01 9.64E+01 9.64E+01 9.60E+01 1.01E+01 9.75E+00 9.05E+00 8.83E+00 8.48E+00 8.64E+00 7.75E+00 1.25E+02 1.24E+02 1.22E+02 1.21E+02 1.20E+02 1.20E+02 1.17E+02 7.02E+01 7.07E+01 7.22E+01 7.25E+01 7.31E+01 7.28E+01 7.47E+01 7.60E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 153 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio @ 5V #2 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.74. Plot of Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 154 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.74. Raw data for Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 5V #2 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 9.55E+01 8.45E+01 8.86E+01 1.02E+02 8.76E+01 8.97E+01 9.15E+01 8.67E+01 8.74E+01 8.97E+01 8.38E+01 1.10E+02 10 9.52E+01 8.46E+01 8.82E+01 1.03E+02 8.76E+01 8.95E+01 9.13E+01 8.68E+01 8.74E+01 8.91E+01 8.37E+01 1.11E+02 20 9.52E+01 8.45E+01 8.82E+01 1.03E+02 8.79E+01 8.94E+01 9.12E+01 8.70E+01 8.73E+01 8.90E+01 8.37E+01 1.12E+02 30 9.54E+01 8.45E+01 8.81E+01 1.04E+02 8.77E+01 8.93E+01 9.13E+01 8.70E+01 8.73E+01 8.90E+01 8.37E+01 1.12E+02 50 9.50E+01 8.46E+01 8.79E+01 1.04E+02 8.79E+01 8.91E+01 9.10E+01 8.72E+01 8.71E+01 8.90E+01 8.37E+01 1.12E+02 60 9.50E+01 8.45E+01 8.80E+01 1.04E+02 8.79E+01 8.91E+01 9.10E+01 8.72E+01 8.72E+01 8.89E+01 8.37E+01 1.11E+02 70 9.35E+01 8.39E+01 8.83E+01 1.10E+02 8.67E+01 8.85E+01 8.98E+01 8.68E+01 8.71E+01 8.81E+01 8.37E+01 1.12E+02 9.17E+01 7.16E+00 1.11E+02 7.21E+01 9.17E+01 7.28E+00 1.12E+02 7.17E+01 9.18E+01 7.50E+00 1.12E+02 7.13E+01 9.19E+01 7.78E+00 1.13E+02 7.06E+01 9.19E+01 7.86E+00 1.13E+02 7.04E+01 9.19E+01 7.88E+00 1.14E+02 7.03E+01 9.25E+01 1.06E+01 1.21E+02 6.36E+01 8.90E+01 8.88E+01 8.88E+01 8.88E+01 8.87E+01 8.87E+01 8.81E+01 1.95E+00 1.81E+00 1.73E+00 1.73E+00 1.58E+00 1.56E+00 1.22E+00 9.43E+01 9.38E+01 9.35E+01 9.35E+01 9.30E+01 9.30E+01 9.14E+01 8.36E+01 8.39E+01 8.40E+01 8.40E+01 8.43E+01 8.44E+01 8.47E+01 7.60E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 155 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching @ 5V (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.75. Plot of Common Mode Rejection Ratio Matching @ 5V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 156 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.75. Raw data for Common Mode Rejection Ratio Matching @ 5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching @ 5V (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.05E+02 8.60E+01 9.26E+01 9.30E+01 9.54E+01 1.05E+02 9.23E+01 1.17E+02 8.89E+01 9.52E+01 8.53E+01 8.93E+01 10 1.05E+02 8.63E+01 9.18E+01 9.27E+01 9.47E+01 1.04E+02 9.23E+01 1.12E+02 8.89E+01 9.52E+01 8.53E+01 8.93E+01 20 1.07E+02 8.63E+01 9.15E+01 9.27E+01 9.51E+01 1.03E+02 9.25E+01 1.08E+02 8.87E+01 9.49E+01 8.52E+01 8.93E+01 30 1.06E+02 8.63E+01 9.08E+01 9.26E+01 9.45E+01 1.03E+02 9.27E+01 1.08E+02 8.87E+01 9.52E+01 8.52E+01 8.93E+01 50 1.07E+02 8.64E+01 9.07E+01 9.28E+01 9.53E+01 1.02E+02 9.25E+01 1.05E+02 8.87E+01 9.55E+01 8.52E+01 8.92E+01 60 1.07E+02 8.64E+01 9.07E+01 9.27E+01 9.52E+01 1.02E+02 9.24E+01 1.05E+02 8.87E+01 9.53E+01 8.52E+01 8.92E+01 70 1.16E+02 8.62E+01 9.01E+01 9.01E+01 9.29E+01 1.00E+02 9.16E+01 1.09E+02 8.88E+01 9.33E+01 8.52E+01 8.92E+01 9.43E+01 6.79E+00 1.13E+02 7.57E+01 9.42E+01 7.00E+00 1.13E+02 7.50E+01 9.44E+01 7.50E+00 1.15E+02 7.39E+01 9.40E+01 7.18E+00 1.14E+02 7.43E+01 9.44E+01 7.69E+00 1.16E+02 7.33E+01 9.44E+01 7.76E+00 1.16E+02 7.32E+01 9.50E+01 1.18E+01 1.27E+02 6.27E+01 9.97E+01 9.84E+01 9.75E+01 9.75E+01 9.69E+01 9.68E+01 9.65E+01 1.14E+01 9.28E+00 7.97E+00 7.83E+00 6.94E+00 6.80E+00 8.10E+00 1.31E+02 1.24E+02 1.19E+02 1.19E+02 1.16E+02 1.15E+02 1.19E+02 6.85E+01 7.29E+01 7.57E+01 7.60E+01 7.79E+01 7.81E+01 7.43E+01 7.50E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 7.00E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 157 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.76. Plot of Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 158 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.76. Raw data for Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.05E+02 1.21E+02 1.05E+02 1.08E+02 1.11E+02 1.05E+02 1.23E+02 1.08E+02 1.10E+02 1.09E+02 1.23E+02 1.13E+02 10 1.05E+02 1.22E+02 1.05E+02 1.08E+02 1.11E+02 1.05E+02 1.23E+02 1.08E+02 1.10E+02 1.09E+02 1.23E+02 1.13E+02 20 1.05E+02 1.22E+02 1.04E+02 1.08E+02 1.11E+02 1.05E+02 1.23E+02 1.08E+02 1.11E+02 1.09E+02 1.22E+02 1.13E+02 30 1.05E+02 1.22E+02 1.04E+02 1.08E+02 1.11E+02 1.05E+02 1.23E+02 1.08E+02 1.11E+02 1.09E+02 1.22E+02 1.12E+02 50 1.05E+02 1.22E+02 1.04E+02 1.08E+02 1.11E+02 1.05E+02 1.23E+02 1.08E+02 1.10E+02 1.09E+02 1.22E+02 1.12E+02 60 1.05E+02 1.22E+02 1.04E+02 1.08E+02 1.12E+02 1.05E+02 1.23E+02 1.08E+02 1.11E+02 1.09E+02 1.23E+02 1.13E+02 70 1.05E+02 1.22E+02 1.04E+02 1.08E+02 1.11E+02 1.05E+02 1.23E+02 1.08E+02 1.10E+02 1.09E+02 1.23E+02 1.12E+02 1.10E+02 6.75E+00 1.29E+02 9.15E+01 1.10E+02 6.98E+00 1.29E+02 9.10E+01 1.10E+02 7.16E+00 1.30E+02 9.06E+01 1.10E+02 7.07E+00 1.29E+02 9.07E+01 1.10E+02 7.23E+00 1.30E+02 9.05E+01 1.10E+02 7.30E+00 1.30E+02 9.03E+01 1.10E+02 7.20E+00 1.30E+02 9.05E+01 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 6.76E+00 7.18E+00 6.89E+00 6.93E+00 7.18E+00 6.95E+00 6.90E+00 1.30E+02 1.31E+02 1.30E+02 1.30E+02 1.31E+02 1.30E+02 1.30E+02 9.25E+01 9.14E+01 9.22E+01 9.20E+01 9.15E+01 9.20E+01 9.21E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 159 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.77. Plot of Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 160 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.77. Raw data for Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.21E+02 1.12E+02 1.03E+02 1.06E+02 1.08E+02 1.16E+02 1.10E+02 1.29E+02 1.09E+02 1.07E+02 1.26E+02 1.10E+02 10 1.20E+02 1.12E+02 1.03E+02 1.06E+02 1.08E+02 1.17E+02 1.10E+02 1.28E+02 1.09E+02 1.07E+02 1.26E+02 1.09E+02 20 1.20E+02 1.12E+02 1.03E+02 1.06E+02 1.08E+02 1.17E+02 1.10E+02 1.29E+02 1.09E+02 1.07E+02 1.26E+02 1.09E+02 30 1.20E+02 1.12E+02 1.03E+02 1.06E+02 1.08E+02 1.17E+02 1.10E+02 1.27E+02 1.09E+02 1.07E+02 1.26E+02 1.09E+02 50 1.20E+02 1.12E+02 1.03E+02 1.06E+02 1.08E+02 1.18E+02 1.10E+02 1.34E+02 1.09E+02 1.07E+02 1.26E+02 1.09E+02 60 1.20E+02 1.12E+02 1.03E+02 1.06E+02 1.08E+02 1.17E+02 1.10E+02 1.27E+02 1.09E+02 1.07E+02 1.26E+02 1.09E+02 70 1.20E+02 1.11E+02 1.03E+02 1.06E+02 1.08E+02 1.17E+02 1.10E+02 1.27E+02 1.09E+02 1.07E+02 1.27E+02 1.09E+02 1.10E+02 6.89E+00 1.29E+02 9.11E+01 1.10E+02 6.64E+00 1.28E+02 9.15E+01 1.10E+02 6.63E+00 1.28E+02 9.15E+01 1.10E+02 6.58E+00 1.28E+02 9.16E+01 1.10E+02 6.70E+00 1.28E+02 9.14E+01 1.10E+02 6.71E+00 1.28E+02 9.13E+01 1.10E+02 6.63E+00 1.28E+02 9.15E+01 1.14E+02 1.14E+02 1.14E+02 1.14E+02 1.16E+02 1.14E+02 1.14E+02 9.07E+00 8.62E+00 8.84E+00 8.32E+00 1.12E+01 8.10E+00 8.32E+00 1.39E+02 1.38E+02 1.39E+02 1.37E+02 1.46E+02 1.36E+02 1.37E+02 8.95E+01 9.08E+01 9.01E+01 9.13E+01 8.49E+01 9.19E+01 9.13E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 8.80E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 161 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.78. Plot of Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 162 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.78. Raw data for Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 1.04E+02 1.09E+02 1.19E+02 1.20E+02 1.19E+02 1.08E+02 1.12E+02 1.09E+02 1.04E+02 1.22E+02 1.18E+02 1.20E+02 10 1.04E+02 1.09E+02 1.19E+02 1.20E+02 1.17E+02 1.07E+02 1.12E+02 1.09E+02 1.04E+02 1.23E+02 1.18E+02 1.19E+02 20 1.04E+02 1.09E+02 1.19E+02 1.19E+02 1.17E+02 1.07E+02 1.12E+02 1.09E+02 1.03E+02 1.23E+02 1.18E+02 1.20E+02 30 1.04E+02 1.09E+02 1.19E+02 1.20E+02 1.18E+02 1.07E+02 1.12E+02 1.09E+02 1.04E+02 1.23E+02 1.18E+02 1.19E+02 50 1.04E+02 1.10E+02 1.19E+02 1.19E+02 1.17E+02 1.07E+02 1.12E+02 1.09E+02 1.04E+02 1.22E+02 1.18E+02 1.19E+02 60 1.04E+02 1.09E+02 1.19E+02 1.20E+02 1.17E+02 1.07E+02 1.12E+02 1.09E+02 1.04E+02 1.23E+02 1.18E+02 1.19E+02 70 1.04E+02 1.09E+02 1.20E+02 1.20E+02 1.17E+02 1.07E+02 1.12E+02 1.09E+02 1.04E+02 1.22E+02 1.18E+02 1.19E+02 1.14E+02 7.19E+00 1.34E+02 9.45E+01 1.14E+02 7.09E+00 1.33E+02 9.45E+01 1.14E+02 6.83E+00 1.32E+02 9.50E+01 1.14E+02 6.99E+00 1.33E+02 9.47E+01 1.14E+02 6.81E+00 1.33E+02 9.52E+01 1.14E+02 6.86E+00 1.33E+02 9.49E+01 1.14E+02 7.22E+00 1.34E+02 9.43E+01 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 1.11E+02 7.12E+00 7.41E+00 7.46E+00 7.45E+00 7.13E+00 7.53E+00 7.15E+00 1.30E+02 1.31E+02 1.32E+02 1.31E+02 1.30E+02 1.32E+02 1.30E+02 9.14E+01 9.06E+01 9.06E+01 9.06E+01 9.11E+01 9.04E+01 9.13E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01 8.20E+01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 163 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 5V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.79. Plot of Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 164 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.79. Raw data for Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.59E-03 1.67E-03 1.67E-03 1.67E-03 1.70E-03 1.75E-03 1.67E-03 1.57E-03 1.64E-03 1.94E-03 1.69E-03 1.65E-03 10 1.84E-03 1.72E-03 1.86E-03 1.71E-03 1.84E-03 1.82E-03 1.84E-03 1.88E-03 1.81E-03 1.94E-03 1.76E-03 1.72E-03 20 1.95E-03 1.65E-03 1.82E-03 1.90E-03 1.93E-03 1.85E-03 1.88E-03 1.95E-03 1.88E-03 1.98E-03 1.82E-03 1.73E-03 30 2.00E-03 1.71E-03 1.85E-03 1.77E-03 1.95E-03 1.77E-03 1.93E-03 1.98E-03 1.88E-03 1.92E-03 1.66E-03 1.80E-03 50 1.97E-03 1.83E-03 1.90E-03 1.93E-03 2.08E-03 1.97E-03 1.98E-03 2.13E-03 1.86E-03 2.08E-03 1.76E-03 1.66E-03 60 2.13E-03 1.77E-03 1.94E-03 1.86E-03 1.97E-03 2.13E-03 1.97E-03 2.21E-03 1.84E-03 2.16E-03 1.82E-03 1.81E-03 70 2.00E-03 1.83E-03 1.85E-03 1.96E-03 1.95E-03 1.81E-03 1.88E-03 2.00E-03 1.88E-03 1.86E-03 1.88E-03 1.75E-03 1.66E-03 4.12E-05 1.77E-03 1.55E-03 1.79E-03 7.27E-05 1.99E-03 1.59E-03 1.85E-03 1.22E-04 2.19E-03 1.51E-03 1.86E-03 1.21E-04 2.19E-03 1.52E-03 1.94E-03 9.26E-05 2.20E-03 1.69E-03 1.93E-03 1.34E-04 2.30E-03 1.57E-03 1.92E-03 7.40E-05 2.12E-03 1.72E-03 1.71E-03 1.86E-03 1.91E-03 1.90E-03 2.00E-03 2.06E-03 1.89E-03 1.42E-04 5.31E-05 5.45E-05 7.89E-05 1.05E-04 1.53E-04 6.99E-05 2.10E-03 2.00E-03 2.06E-03 2.11E-03 2.29E-03 2.48E-03 2.08E-03 1.32E-03 1.71E-03 1.76E-03 1.68E-03 1.72E-03 1.64E-03 1.69E-03 1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 165 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 5V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.80. Plot of Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 166 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.80. Raw data for Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.69E-03 1.72E-03 1.67E-03 1.75E-03 1.79E-03 1.87E-03 1.81E-03 1.67E-03 1.64E-03 1.81E-03 1.75E-03 1.74E-03 10 1.71E-03 1.72E-03 1.82E-03 1.74E-03 1.93E-03 1.94E-03 1.89E-03 1.82E-03 1.88E-03 1.98E-03 1.86E-03 1.81E-03 20 1.87E-03 1.68E-03 1.92E-03 1.85E-03 1.88E-03 1.93E-03 1.95E-03 2.05E-03 1.88E-03 1.97E-03 1.78E-03 1.75E-03 30 1.77E-03 1.77E-03 1.85E-03 1.80E-03 1.92E-03 1.88E-03 1.97E-03 2.09E-03 1.80E-03 2.02E-03 1.71E-03 1.78E-03 50 1.90E-03 1.85E-03 1.86E-03 1.90E-03 2.07E-03 1.98E-03 1.95E-03 2.10E-03 1.93E-03 2.05E-03 1.73E-03 1.81E-03 60 1.87E-03 1.81E-03 1.94E-03 2.04E-03 2.03E-03 2.06E-03 2.13E-03 2.21E-03 2.11E-03 2.23E-03 1.74E-03 1.86E-03 70 1.95E-03 1.75E-03 1.88E-03 1.88E-03 2.17E-03 1.98E-03 1.78E-03 1.95E-03 1.98E-03 2.02E-03 1.71E-03 1.76E-03 1.72E-03 4.77E-05 1.85E-03 1.59E-03 1.78E-03 9.24E-05 2.04E-03 1.53E-03 1.84E-03 9.30E-05 2.10E-03 1.58E-03 1.82E-03 6.38E-05 2.00E-03 1.65E-03 1.92E-03 8.91E-05 2.16E-03 1.67E-03 1.94E-03 9.98E-05 2.21E-03 1.66E-03 1.93E-03 1.54E-04 2.35E-03 1.50E-03 1.76E-03 1.90E-03 1.96E-03 1.95E-03 2.00E-03 2.15E-03 1.94E-03 9.95E-05 6.10E-05 6.23E-05 1.14E-04 7.12E-05 7.09E-05 9.39E-05 2.03E-03 2.07E-03 2.13E-03 2.27E-03 2.20E-03 2.34E-03 2.20E-03 1.49E-03 1.73E-03 1.79E-03 1.64E-03 1.81E-03 1.95E-03 1.68E-03 1.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 167 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 5V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.81. Plot of Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 168 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.81. Raw data for Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 6.23E-02 5.97E-02 6.18E-02 5.94E-02 6.42E-02 6.30E-02 6.19E-02 6.19E-02 5.99E-02 6.46E-02 6.26E-02 6.29E-02 10 6.39E-02 6.10E-02 6.30E-02 6.05E-02 6.58E-02 6.36E-02 6.25E-02 6.25E-02 6.06E-02 6.53E-02 6.28E-02 6.32E-02 20 6.46E-02 6.17E-02 6.39E-02 6.12E-02 6.66E-02 6.41E-02 6.31E-02 6.30E-02 6.10E-02 6.59E-02 6.25E-02 6.30E-02 30 6.51E-02 6.23E-02 6.43E-02 6.17E-02 6.70E-02 6.44E-02 6.35E-02 6.36E-02 6.14E-02 6.60E-02 6.30E-02 6.34E-02 50 6.55E-02 6.27E-02 6.46E-02 6.24E-02 6.77E-02 6.49E-02 6.36E-02 6.39E-02 6.14E-02 6.70E-02 6.30E-02 6.34E-02 60 6.57E-02 6.27E-02 6.48E-02 6.23E-02 6.80E-02 6.48E-02 6.38E-02 6.39E-02 6.15E-02 6.68E-02 6.30E-02 6.34E-02 70 6.53E-02 6.25E-02 6.45E-02 6.20E-02 6.75E-02 6.47E-02 6.33E-02 6.32E-02 6.12E-02 6.62E-02 6.30E-02 6.34E-02 6.15E-02 1.99E-03 6.69E-02 5.60E-02 6.29E-02 2.17E-03 6.88E-02 5.69E-02 6.36E-02 2.21E-03 6.97E-02 5.75E-02 6.41E-02 2.14E-03 7.00E-02 5.82E-02 6.46E-02 2.17E-03 7.05E-02 5.86E-02 6.47E-02 2.29E-03 7.10E-02 5.84E-02 6.43E-02 2.22E-03 7.04E-02 5.83E-02 6.23E-02 6.29E-02 6.34E-02 6.38E-02 6.42E-02 6.42E-02 6.37E-02 1.74E-03 1.70E-03 1.80E-03 1.68E-03 2.01E-03 1.88E-03 1.84E-03 6.70E-02 6.76E-02 6.84E-02 6.84E-02 6.97E-02 6.93E-02 6.87E-02 5.75E-02 5.82E-02 5.85E-02 5.92E-02 5.87E-02 5.90E-02 5.87E-02 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 169 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 5V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.82. Plot of Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 170 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.82. Raw data for Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 6.23E-02 5.85E-02 6.15E-02 5.91E-02 6.45E-02 6.33E-02 6.19E-02 6.14E-02 6.02E-02 6.39E-02 6.28E-02 6.26E-02 10 6.37E-02 5.98E-02 6.29E-02 6.03E-02 6.61E-02 6.39E-02 6.25E-02 6.23E-02 6.06E-02 6.44E-02 6.32E-02 6.28E-02 20 6.42E-02 6.05E-02 6.32E-02 6.08E-02 6.66E-02 6.44E-02 6.29E-02 6.28E-02 6.10E-02 6.52E-02 6.31E-02 6.28E-02 30 6.47E-02 6.10E-02 6.39E-02 6.14E-02 6.73E-02 6.49E-02 6.34E-02 6.32E-02 6.14E-02 6.56E-02 6.36E-02 6.32E-02 50 6.51E-02 6.15E-02 6.43E-02 6.19E-02 6.76E-02 6.51E-02 6.39E-02 6.38E-02 6.18E-02 6.62E-02 6.34E-02 6.30E-02 60 6.55E-02 6.17E-02 6.47E-02 6.20E-02 6.77E-02 6.53E-02 6.36E-02 6.35E-02 6.20E-02 6.60E-02 6.33E-02 6.29E-02 70 6.49E-02 6.12E-02 6.41E-02 6.16E-02 6.75E-02 6.45E-02 6.35E-02 6.29E-02 6.13E-02 6.58E-02 6.35E-02 6.31E-02 6.12E-02 2.42E-03 6.78E-02 5.45E-02 6.26E-02 2.56E-03 6.96E-02 5.55E-02 6.31E-02 2.53E-03 7.00E-02 5.61E-02 6.37E-02 2.58E-03 7.08E-02 5.66E-02 6.41E-02 2.49E-03 7.09E-02 5.72E-02 6.43E-02 2.53E-03 7.13E-02 5.74E-02 6.39E-02 2.59E-03 7.10E-02 5.68E-02 6.21E-02 6.28E-02 6.32E-02 6.37E-02 6.41E-02 6.41E-02 6.36E-02 1.47E-03 1.49E-03 1.63E-03 1.62E-03 1.64E-03 1.59E-03 1.68E-03 6.62E-02 6.68E-02 6.77E-02 6.81E-02 6.86E-02 6.84E-02 6.82E-02 5.81E-02 5.87E-02 5.88E-02 5.92E-02 5.97E-02 5.97E-02 5.90E-02 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 1.50E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 171 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.83. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 172 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.83. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.14E-01 1.11E-01 1.13E-01 1.10E-01 1.17E-01 1.15E-01 1.13E-01 1.14E-01 1.11E-01 1.17E-01 1.15E-01 1.16E-01 10 1.16E-01 1.12E-01 1.15E-01 1.11E-01 1.19E-01 1.17E-01 1.14E-01 1.14E-01 1.12E-01 1.19E-01 1.16E-01 1.16E-01 20 1.17E-01 1.13E-01 1.16E-01 1.13E-01 1.20E-01 1.17E-01 1.15E-01 1.15E-01 1.13E-01 1.19E-01 1.15E-01 1.16E-01 30 1.18E-01 1.14E-01 1.17E-01 1.13E-01 1.21E-01 1.18E-01 1.16E-01 1.16E-01 1.13E-01 1.21E-01 1.17E-01 1.17E-01 50 1.18E-01 1.15E-01 1.17E-01 1.14E-01 1.22E-01 1.18E-01 1.16E-01 1.16E-01 1.13E-01 1.21E-01 1.16E-01 1.17E-01 60 1.19E-01 1.15E-01 1.18E-01 1.14E-01 1.22E-01 1.18E-01 1.16E-01 1.17E-01 1.13E-01 1.21E-01 1.16E-01 1.16E-01 70 1.18E-01 1.15E-01 1.17E-01 1.14E-01 1.21E-01 1.18E-01 1.16E-01 1.16E-01 1.13E-01 1.20E-01 1.16E-01 1.16E-01 1.13E-01 2.94E-03 1.21E-01 1.05E-01 1.15E-01 2.96E-03 1.23E-01 1.07E-01 1.16E-01 3.06E-03 1.24E-01 1.07E-01 1.17E-01 3.13E-03 1.25E-01 1.08E-01 1.17E-01 3.06E-03 1.26E-01 1.09E-01 1.17E-01 3.36E-03 1.27E-01 1.08E-01 1.17E-01 3.01E-03 1.25E-01 1.09E-01 1.14E-01 1.15E-01 1.16E-01 1.17E-01 1.17E-01 1.17E-01 1.16E-01 2.29E-03 2.49E-03 2.32E-03 2.68E-03 2.69E-03 2.77E-03 2.28E-03 1.20E-01 1.22E-01 1.22E-01 1.24E-01 1.24E-01 1.25E-01 1.23E-01 1.08E-01 1.08E-01 1.09E-01 1.09E-01 1.10E-01 1.09E-01 1.10E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 173 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.84. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 174 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.84. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.14E-01 1.09E-01 1.13E-01 1.10E-01 1.18E-01 1.16E-01 1.13E-01 1.13E-01 1.11E-01 1.16E-01 1.15E-01 1.15E-01 10 1.16E-01 1.11E-01 1.15E-01 1.11E-01 1.19E-01 1.17E-01 1.14E-01 1.14E-01 1.12E-01 1.18E-01 1.16E-01 1.15E-01 20 1.17E-01 1.12E-01 1.16E-01 1.12E-01 1.20E-01 1.18E-01 1.15E-01 1.15E-01 1.13E-01 1.18E-01 1.16E-01 1.15E-01 30 1.18E-01 1.12E-01 1.17E-01 1.13E-01 1.21E-01 1.19E-01 1.16E-01 1.16E-01 1.13E-01 1.19E-01 1.16E-01 1.16E-01 50 1.18E-01 1.13E-01 1.17E-01 1.13E-01 1.22E-01 1.19E-01 1.16E-01 1.16E-01 1.13E-01 1.20E-01 1.16E-01 1.16E-01 60 1.18E-01 1.13E-01 1.17E-01 1.14E-01 1.22E-01 1.19E-01 1.16E-01 1.16E-01 1.14E-01 1.20E-01 1.17E-01 1.16E-01 70 1.18E-01 1.13E-01 1.17E-01 1.13E-01 1.21E-01 1.18E-01 1.16E-01 1.16E-01 1.13E-01 1.19E-01 1.16E-01 1.16E-01 1.13E-01 3.49E-03 1.22E-01 1.03E-01 1.14E-01 3.59E-03 1.24E-01 1.05E-01 1.15E-01 3.60E-03 1.25E-01 1.05E-01 1.16E-01 3.60E-03 1.26E-01 1.06E-01 1.16E-01 3.73E-03 1.27E-01 1.06E-01 1.17E-01 3.58E-03 1.27E-01 1.07E-01 1.16E-01 3.49E-03 1.26E-01 1.07E-01 1.14E-01 1.15E-01 1.16E-01 1.17E-01 1.17E-01 1.17E-01 1.16E-01 2.16E-03 2.26E-03 2.32E-03 2.26E-03 2.50E-03 2.33E-03 2.25E-03 1.20E-01 1.21E-01 1.22E-01 1.23E-01 1.24E-01 1.23E-01 1.23E-01 1.08E-01 1.09E-01 1.09E-01 1.10E-01 1.10E-01 1.11E-01 1.10E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 2.50E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 175 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 5V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.85. Plot of Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 176 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.85. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.47E-02 1.46E-02 1.40E-02 1.49E-02 1.41E-02 1.41E-02 1.47E-02 1.41E-02 1.45E-02 1.42E-02 1.43E-02 1.41E-02 10 1.50E-02 1.50E-02 1.44E-02 1.53E-02 1.46E-02 1.44E-02 1.49E-02 1.43E-02 1.48E-02 1.44E-02 1.42E-02 1.43E-02 20 1.50E-02 1.51E-02 1.45E-02 1.54E-02 1.46E-02 1.47E-02 1.50E-02 1.47E-02 1.49E-02 1.45E-02 1.45E-02 1.44E-02 30 1.52E-02 1.54E-02 1.48E-02 1.57E-02 1.50E-02 1.49E-02 1.54E-02 1.50E-02 1.51E-02 1.49E-02 1.45E-02 1.44E-02 50 1.52E-02 1.53E-02 1.49E-02 1.57E-02 1.49E-02 1.50E-02 1.56E-02 1.51E-02 1.55E-02 1.51E-02 1.45E-02 1.44E-02 60 1.54E-02 1.53E-02 1.48E-02 1.57E-02 1.49E-02 1.51E-02 1.57E-02 1.51E-02 1.53E-02 1.52E-02 1.45E-02 1.45E-02 70 1.52E-02 1.52E-02 1.47E-02 1.56E-02 1.47E-02 1.48E-02 1.53E-02 1.46E-02 1.50E-02 1.47E-02 1.45E-02 1.44E-02 1.44E-02 4.21E-04 1.56E-02 1.33E-02 1.49E-02 3.63E-04 1.59E-02 1.39E-02 1.49E-02 3.64E-04 1.59E-02 1.39E-02 1.52E-02 3.51E-04 1.62E-02 1.43E-02 1.52E-02 3.00E-04 1.60E-02 1.44E-02 1.52E-02 3.44E-04 1.62E-02 1.43E-02 1.51E-02 3.90E-04 1.62E-02 1.40E-02 1.43E-02 1.46E-02 1.48E-02 1.51E-02 1.53E-02 1.53E-02 1.49E-02 2.88E-04 2.90E-04 2.07E-04 2.02E-04 2.44E-04 2.36E-04 2.71E-04 1.51E-02 1.54E-02 1.53E-02 1.56E-02 1.59E-02 1.59E-02 1.56E-02 1.35E-02 1.38E-02 1.42E-02 1.45E-02 1.46E-02 1.46E-02 1.41E-02 3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 177 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 5V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.86. Plot of Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 178 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.86. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 1.49E-02 1.51E-02 1.46E-02 1.53E-02 1.43E-02 1.44E-02 1.48E-02 1.44E-02 1.48E-02 1.46E-02 1.45E-02 1.42E-02 10 1.53E-02 1.54E-02 1.49E-02 1.55E-02 1.47E-02 1.46E-02 1.53E-02 1.48E-02 1.48E-02 1.49E-02 1.47E-02 1.43E-02 20 1.55E-02 1.56E-02 1.50E-02 1.58E-02 1.49E-02 1.48E-02 1.55E-02 1.50E-02 1.53E-02 1.51E-02 1.46E-02 1.44E-02 30 1.59E-02 1.57E-02 1.51E-02 1.59E-02 1.50E-02 1.51E-02 1.57E-02 1.53E-02 1.53E-02 1.52E-02 1.47E-02 1.44E-02 50 1.58E-02 1.56E-02 1.50E-02 1.60E-02 1.51E-02 1.53E-02 1.58E-02 1.55E-02 1.57E-02 1.57E-02 1.49E-02 1.44E-02 60 1.58E-02 1.58E-02 1.52E-02 1.59E-02 1.51E-02 1.52E-02 1.58E-02 1.55E-02 1.56E-02 1.56E-02 1.46E-02 1.45E-02 70 1.57E-02 1.57E-02 1.50E-02 1.60E-02 1.50E-02 1.49E-02 1.55E-02 1.50E-02 1.51E-02 1.52E-02 1.46E-02 1.43E-02 1.48E-02 4.13E-04 1.60E-02 1.37E-02 1.52E-02 3.61E-04 1.62E-02 1.42E-02 1.53E-02 3.71E-04 1.64E-02 1.43E-02 1.55E-02 4.25E-04 1.67E-02 1.44E-02 1.55E-02 4.02E-04 1.66E-02 1.44E-02 1.56E-02 3.86E-04 1.66E-02 1.45E-02 1.55E-02 4.57E-04 1.67E-02 1.42E-02 1.46E-02 1.49E-02 1.51E-02 1.53E-02 1.56E-02 1.55E-02 1.51E-02 1.89E-04 2.52E-04 2.70E-04 2.15E-04 1.88E-04 2.17E-04 2.36E-04 1.51E-02 1.55E-02 1.59E-02 1.59E-02 1.61E-02 1.61E-02 1.58E-02 1.41E-02 1.42E-02 1.44E-02 1.47E-02 1.51E-02 1.49E-02 1.45E-02 3.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 6.00E-02 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 179 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 5V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.87. Plot of Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 180 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.87. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.38E-02 3.39E-02 3.24E-02 3.38E-02 3.30E-02 3.35E-02 3.37E-02 3.29E-02 3.34E-02 3.33E-02 3.35E-02 3.34E-02 10 3.43E-02 3.43E-02 3.32E-02 3.41E-02 3.32E-02 3.38E-02 3.41E-02 3.34E-02 3.36E-02 3.35E-02 3.35E-02 3.35E-02 20 3.45E-02 3.45E-02 3.32E-02 3.45E-02 3.35E-02 3.39E-02 3.41E-02 3.34E-02 3.39E-02 3.38E-02 3.34E-02 3.34E-02 30 3.47E-02 3.47E-02 3.36E-02 3.46E-02 3.38E-02 3.42E-02 3.45E-02 3.38E-02 3.42E-02 3.40E-02 3.38E-02 3.36E-02 50 3.46E-02 3.46E-02 3.36E-02 3.47E-02 3.41E-02 3.45E-02 3.45E-02 3.41E-02 3.42E-02 3.44E-02 3.36E-02 3.37E-02 60 3.50E-02 3.50E-02 3.36E-02 3.47E-02 3.41E-02 3.45E-02 3.45E-02 3.40E-02 3.42E-02 3.44E-02 3.36E-02 3.36E-02 70 3.48E-02 3.45E-02 3.34E-02 3.46E-02 3.38E-02 3.40E-02 3.43E-02 3.38E-02 3.40E-02 3.40E-02 3.37E-02 3.35E-02 3.33E-02 6.30E-04 3.51E-02 3.16E-02 3.38E-02 5.57E-04 3.53E-02 3.23E-02 3.40E-02 6.14E-04 3.57E-02 3.24E-02 3.43E-02 5.73E-04 3.58E-02 3.27E-02 3.43E-02 4.73E-04 3.56E-02 3.30E-02 3.45E-02 6.02E-04 3.61E-02 3.28E-02 3.42E-02 5.80E-04 3.58E-02 3.26E-02 3.34E-02 3.37E-02 3.38E-02 3.41E-02 3.43E-02 3.43E-02 3.40E-02 2.90E-04 2.85E-04 2.57E-04 2.61E-04 1.74E-04 2.24E-04 1.73E-04 3.42E-02 3.45E-02 3.45E-02 3.49E-02 3.48E-02 3.49E-02 3.45E-02 3.26E-02 3.29E-02 3.31E-02 3.34E-02 3.39E-02 3.37E-02 3.35E-02 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 181 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 5V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.88. Plot of Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 182 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.88. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 3.42E-02 3.42E-02 3.35E-02 3.42E-02 3.35E-02 3.35E-02 3.40E-02 3.34E-02 3.37E-02 3.36E-02 3.37E-02 3.35E-02 10 3.46E-02 3.46E-02 3.38E-02 3.47E-02 3.38E-02 3.39E-02 3.42E-02 3.38E-02 3.40E-02 3.42E-02 3.38E-02 3.35E-02 20 3.49E-02 3.49E-02 3.39E-02 3.51E-02 3.39E-02 3.39E-02 3.45E-02 3.39E-02 3.41E-02 3.44E-02 3.39E-02 3.36E-02 30 3.50E-02 3.50E-02 3.41E-02 3.53E-02 3.40E-02 3.43E-02 3.48E-02 3.43E-02 3.44E-02 3.46E-02 3.41E-02 3.38E-02 50 3.51E-02 3.50E-02 3.41E-02 3.52E-02 3.43E-02 3.44E-02 3.49E-02 3.44E-02 3.47E-02 3.51E-02 3.39E-02 3.35E-02 60 3.51E-02 3.52E-02 3.42E-02 3.54E-02 3.43E-02 3.45E-02 3.51E-02 3.45E-02 3.46E-02 3.49E-02 3.39E-02 3.36E-02 70 3.50E-02 3.50E-02 3.40E-02 3.52E-02 3.42E-02 3.42E-02 3.47E-02 3.40E-02 3.44E-02 3.46E-02 3.39E-02 3.38E-02 3.39E-02 3.82E-04 3.49E-02 3.29E-02 3.43E-02 4.61E-04 3.56E-02 3.30E-02 3.45E-02 5.67E-04 3.61E-02 3.30E-02 3.47E-02 5.93E-04 3.63E-02 3.31E-02 3.47E-02 5.19E-04 3.62E-02 3.33E-02 3.48E-02 5.78E-04 3.64E-02 3.33E-02 3.47E-02 5.65E-04 3.62E-02 3.31E-02 3.36E-02 3.40E-02 3.42E-02 3.45E-02 3.47E-02 3.47E-02 3.44E-02 2.36E-04 2.03E-04 2.80E-04 2.14E-04 3.01E-04 2.78E-04 2.71E-04 3.43E-02 3.46E-02 3.49E-02 3.51E-02 3.55E-02 3.55E-02 3.51E-02 3.30E-02 3.35E-02 3.34E-02 3.39E-02 3.39E-02 3.40E-02 3.36E-02 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 1.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 183 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.89. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 184 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.89. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 7.41E-02 7.42E-02 7.12E-02 7.40E-02 7.28E-02 7.39E-02 7.34E-02 7.27E-02 7.34E-02 7.34E-02 7.32E-02 7.34E-02 10 7.45E-02 7.46E-02 7.18E-02 7.42E-02 7.33E-02 7.41E-02 7.39E-02 7.27E-02 7.36E-02 7.35E-02 7.32E-02 7.34E-02 20 7.52E-02 7.51E-02 7.28E-02 7.45E-02 7.35E-02 7.43E-02 7.41E-02 7.33E-02 7.34E-02 7.38E-02 7.37E-02 7.36E-02 30 7.54E-02 7.54E-02 7.31E-02 7.50E-02 7.39E-02 7.44E-02 7.47E-02 7.38E-02 7.45E-02 7.44E-02 7.37E-02 7.38E-02 50 7.57E-02 7.54E-02 7.28E-02 7.51E-02 7.39E-02 7.49E-02 7.44E-02 7.37E-02 7.44E-02 7.47E-02 7.37E-02 7.34E-02 60 7.57E-02 7.57E-02 7.29E-02 7.52E-02 7.43E-02 7.44E-02 7.47E-02 7.38E-02 7.45E-02 7.46E-02 7.38E-02 7.36E-02 70 7.57E-02 7.55E-02 7.30E-02 7.51E-02 7.43E-02 7.44E-02 7.42E-02 7.32E-02 7.43E-02 7.42E-02 7.40E-02 7.36E-02 7.33E-02 1.28E-03 7.68E-02 6.97E-02 7.37E-02 1.15E-03 7.68E-02 7.05E-02 7.42E-02 1.03E-03 7.70E-02 7.14E-02 7.45E-02 1.02E-03 7.74E-02 7.17E-02 7.46E-02 1.19E-03 7.78E-02 7.13E-02 7.48E-02 1.18E-03 7.80E-02 7.15E-02 7.47E-02 1.09E-03 7.77E-02 7.17E-02 7.34E-02 7.36E-02 7.38E-02 7.44E-02 7.44E-02 7.44E-02 7.40E-02 3.99E-04 5.20E-04 4.46E-04 3.28E-04 4.30E-04 3.63E-04 5.03E-04 7.44E-02 7.50E-02 7.50E-02 7.53E-02 7.56E-02 7.54E-02 7.54E-02 7.23E-02 7.22E-02 7.26E-02 7.35E-02 7.32E-02 7.34E-02 7.27E-02 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 185 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.90. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 186 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.90. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 7.50E-02 7.48E-02 7.28E-02 7.47E-02 7.34E-02 7.37E-02 7.43E-02 7.33E-02 7.40E-02 7.38E-02 7.36E-02 7.32E-02 10 7.52E-02 7.55E-02 7.33E-02 7.52E-02 7.38E-02 7.42E-02 7.42E-02 7.37E-02 7.43E-02 7.43E-02 7.38E-02 7.35E-02 20 7.56E-02 7.59E-02 7.35E-02 7.59E-02 7.37E-02 7.41E-02 7.48E-02 7.40E-02 7.42E-02 7.44E-02 7.40E-02 7.40E-02 30 7.62E-02 7.61E-02 7.41E-02 7.60E-02 7.47E-02 7.49E-02 7.55E-02 7.44E-02 7.49E-02 7.51E-02 7.45E-02 7.40E-02 50 7.62E-02 7.64E-02 7.42E-02 7.63E-02 7.46E-02 7.47E-02 7.55E-02 7.46E-02 7.52E-02 7.52E-02 7.42E-02 7.42E-02 60 7.63E-02 7.60E-02 7.39E-02 7.61E-02 7.47E-02 7.49E-02 7.53E-02 7.45E-02 7.54E-02 7.53E-02 7.45E-02 7.41E-02 70 7.59E-02 7.57E-02 7.39E-02 7.61E-02 7.47E-02 7.44E-02 7.52E-02 7.43E-02 7.48E-02 7.51E-02 7.44E-02 7.41E-02 7.41E-02 9.81E-04 7.68E-02 7.14E-02 7.46E-02 9.86E-04 7.73E-02 7.19E-02 7.49E-02 1.20E-03 7.82E-02 7.16E-02 7.54E-02 9.76E-04 7.81E-02 7.27E-02 7.55E-02 1.07E-03 7.85E-02 7.26E-02 7.54E-02 1.07E-03 7.83E-02 7.25E-02 7.52E-02 9.25E-04 7.78E-02 7.27E-02 7.38E-02 7.41E-02 7.43E-02 7.50E-02 7.50E-02 7.51E-02 7.47E-02 3.94E-04 2.61E-04 3.33E-04 3.79E-04 4.02E-04 4.01E-04 4.05E-04 7.49E-02 7.48E-02 7.52E-02 7.60E-02 7.61E-02 7.62E-02 7.59E-02 7.28E-02 7.34E-02 7.34E-02 7.39E-02 7.39E-02 7.40E-02 7.36E-02 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 2.00E-01 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 187 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 5V #1 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.91. Plot of Positive Short-Circuit Current @ 5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 188 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.91. Raw data for Positive Short-Circuit Current @ 5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 5V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -2.59E-02 -2.76E-02 -2.58E-02 -2.67E-02 -2.49E-02 -2.57E-02 -2.57E-02 -2.62E-02 -2.74E-02 -2.48E-02 -2.60E-02 -2.57E-02 10 -2.56E-02 -2.71E-02 -2.54E-02 -2.62E-02 -2.45E-02 -2.54E-02 -2.55E-02 -2.59E-02 -2.72E-02 -2.46E-02 -2.60E-02 -2.57E-02 20 -2.54E-02 -2.70E-02 -2.53E-02 -2.60E-02 -2.44E-02 -2.53E-02 -2.53E-02 -2.57E-02 -2.70E-02 -2.44E-02 -2.60E-02 -2.58E-02 30 -2.54E-02 -2.69E-02 -2.53E-02 -2.61E-02 -2.43E-02 -2.52E-02 -2.54E-02 -2.57E-02 -2.70E-02 -2.44E-02 -2.61E-02 -2.59E-02 50 -2.50E-02 -2.65E-02 -2.50E-02 -2.56E-02 -2.40E-02 -2.50E-02 -2.50E-02 -2.53E-02 -2.67E-02 -2.40E-02 -2.61E-02 -2.58E-02 60 -2.51E-02 -2.66E-02 -2.50E-02 -2.57E-02 -2.40E-02 -2.50E-02 -2.51E-02 -2.53E-02 -2.68E-02 -2.40E-02 -2.61E-02 -2.58E-02 70 -2.52E-02 -2.67E-02 -2.52E-02 -2.59E-02 -2.42E-02 -2.53E-02 -2.54E-02 -2.58E-02 -2.71E-02 -2.44E-02 -2.61E-02 -2.58E-02 -2.62E-02 1.01E-03 -2.34E-02 -2.89E-02 -2.58E-02 9.67E-04 -2.31E-02 -2.84E-02 -2.56E-02 9.59E-04 -2.30E-02 -2.82E-02 -2.56E-02 9.78E-04 -2.29E-02 -2.83E-02 -2.52E-02 9.18E-04 -2.27E-02 -2.77E-02 -2.53E-02 9.36E-04 -2.27E-02 -2.79E-02 -2.54E-02 9.61E-04 -2.28E-02 -2.81E-02 -2.60E-02 -2.57E-02 -2.55E-02 -2.55E-02 -2.52E-02 -2.52E-02 -2.56E-02 9.46E-04 9.45E-04 9.60E-04 9.76E-04 9.87E-04 9.88E-04 9.58E-04 -2.34E-02 -2.31E-02 -2.29E-02 -2.29E-02 -2.25E-02 -2.25E-02 -2.30E-02 -2.86E-02 -2.83E-02 -2.82E-02 -2.82E-02 -2.79E-02 -2.79E-02 -2.82E-02 -1.25E-02 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 189 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 5V #2 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.92. Plot of Positive Short-Circuit Current @ 5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 190 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.92. Raw data for Positive Short-Circuit Current @ 5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 5V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24-hr Anneal 168-hr Anneal 0 -2.60E-02 -2.81E-02 -2.62E-02 -2.73E-02 -2.49E-02 -2.54E-02 -2.59E-02 -2.65E-02 -2.73E-02 -2.52E-02 -2.58E-02 -2.59E-02 10 -2.56E-02 -2.76E-02 -2.59E-02 -2.68E-02 -2.45E-02 -2.52E-02 -2.56E-02 -2.62E-02 -2.70E-02 -2.50E-02 -2.58E-02 -2.59E-02 20 -2.55E-02 -2.75E-02 -2.57E-02 -2.66E-02 -2.44E-02 -2.50E-02 -2.54E-02 -2.60E-02 -2.69E-02 -2.48E-02 -2.58E-02 -2.60E-02 30 -2.55E-02 -2.75E-02 -2.57E-02 -2.67E-02 -2.43E-02 -2.50E-02 -2.55E-02 -2.60E-02 -2.69E-02 -2.48E-02 -2.59E-02 -2.61E-02 50 -2.51E-02 -2.69E-02 -2.54E-02 -2.62E-02 -2.40E-02 -2.47E-02 -2.51E-02 -2.56E-02 -2.66E-02 -2.44E-02 -2.59E-02 -2.60E-02 60 -2.52E-02 -2.70E-02 -2.55E-02 -2.63E-02 -2.41E-02 -2.48E-02 -2.52E-02 -2.56E-02 -2.66E-02 -2.44E-02 -2.59E-02 -2.60E-02 70 -2.53E-02 -2.72E-02 -2.56E-02 -2.65E-02 -2.42E-02 -2.51E-02 -2.55E-02 -2.61E-02 -2.69E-02 -2.48E-02 -2.59E-02 -2.61E-02 -2.65E-02 1.24E-03 -2.31E-02 -2.99E-02 -2.61E-02 1.18E-03 -2.29E-02 -2.93E-02 -2.59E-02 1.17E-03 -2.27E-02 -2.92E-02 -2.59E-02 1.19E-03 -2.27E-02 -2.92E-02 -2.55E-02 1.10E-03 -2.25E-02 -2.85E-02 -2.56E-02 1.13E-03 -2.25E-02 -2.87E-02 -2.58E-02 1.18E-03 -2.25E-02 -2.90E-02 -2.61E-02 -2.58E-02 -2.56E-02 -2.56E-02 -2.53E-02 -2.53E-02 -2.57E-02 8.30E-04 8.18E-04 8.29E-04 8.47E-04 8.42E-04 8.44E-04 8.35E-04 -2.38E-02 -2.36E-02 -2.34E-02 -2.33E-02 -2.30E-02 -2.30E-02 -2.34E-02 -2.83E-02 -2.81E-02 -2.79E-02 -2.79E-02 -2.76E-02 -2.76E-02 -2.80E-02 -1.25E-02 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 -8.00E-03 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 191 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 5V #1 (A) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.93. Plot of Negative Short-Circuit Current @ 5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 192 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.93. Raw data for Negative Short-Circuit Current @ 5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 5V #1 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 4.94E-02 5.19E-02 5.33E-02 5.20E-02 5.06E-02 5.10E-02 5.17E-02 5.22E-02 5.23E-02 5.10E-02 5.13E-02 5.16E-02 10 4.90E-02 5.15E-02 5.28E-02 5.16E-02 5.01E-02 5.07E-02 5.13E-02 5.18E-02 5.19E-02 5.06E-02 5.12E-02 5.15E-02 20 4.86E-02 5.11E-02 5.25E-02 5.12E-02 4.98E-02 5.05E-02 5.12E-02 5.16E-02 5.17E-02 5.04E-02 5.10E-02 5.13E-02 30 4.80E-02 5.06E-02 5.19E-02 5.07E-02 4.93E-02 4.99E-02 5.06E-02 5.11E-02 5.12E-02 4.99E-02 5.06E-02 5.08E-02 50 4.83E-02 5.07E-02 5.21E-02 5.08E-02 4.94E-02 5.00E-02 5.06E-02 5.10E-02 5.12E-02 4.98E-02 5.07E-02 5.10E-02 60 4.80E-02 5.05E-02 5.18E-02 5.06E-02 4.92E-02 4.99E-02 5.06E-02 5.10E-02 5.12E-02 4.99E-02 5.07E-02 5.11E-02 70 4.82E-02 5.06E-02 5.21E-02 5.07E-02 4.93E-02 5.01E-02 5.07E-02 5.11E-02 5.12E-02 4.99E-02 5.06E-02 5.08E-02 5.14E-02 1.48E-03 5.55E-02 4.74E-02 5.10E-02 1.45E-03 5.50E-02 4.70E-02 5.07E-02 1.49E-03 5.47E-02 4.66E-02 5.01E-02 1.49E-03 5.42E-02 4.60E-02 5.03E-02 1.45E-03 5.42E-02 4.63E-02 5.00E-02 1.47E-03 5.40E-02 4.60E-02 5.02E-02 1.48E-03 5.43E-02 4.61E-02 5.16E-02 5.13E-02 5.11E-02 5.05E-02 5.05E-02 5.05E-02 5.06E-02 6.25E-04 6.20E-04 6.08E-04 6.25E-04 6.22E-04 6.11E-04 6.04E-04 5.33E-02 5.30E-02 5.27E-02 5.22E-02 5.22E-02 5.22E-02 5.22E-02 4.99E-02 4.96E-02 4.94E-02 4.88E-02 4.88E-02 4.88E-02 4.89E-02 1.25E-02 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 193 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 5V #2 (A) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.94. Plot of Negative Short-Circuit Current @ 5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 194 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table 5.94. Raw data for Negative Short-Circuit Current @ 5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 5V #2 (A) Device 45 46 47 60 61 62 63 64 65 77 99 100 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24-hr Anneal 168-hr Anneal 0 4.89E-02 5.14E-02 5.20E-02 5.08E-02 4.96E-02 5.03E-02 5.07E-02 5.11E-02 5.17E-02 5.00E-02 5.06E-02 5.07E-02 10 4.84E-02 5.10E-02 5.17E-02 5.04E-02 4.91E-02 5.00E-02 5.05E-02 5.07E-02 5.13E-02 4.95E-02 5.04E-02 5.06E-02 20 4.80E-02 5.07E-02 5.13E-02 5.00E-02 4.89E-02 4.98E-02 5.02E-02 5.05E-02 5.11E-02 4.93E-02 5.02E-02 5.04E-02 30 4.76E-02 5.01E-02 5.08E-02 4.95E-02 4.83E-02 4.93E-02 4.98E-02 5.00E-02 5.06E-02 4.89E-02 4.97E-02 5.00E-02 50 4.77E-02 5.03E-02 5.08E-02 4.96E-02 4.84E-02 4.93E-02 4.98E-02 4.99E-02 5.06E-02 4.88E-02 4.99E-02 5.01E-02 60 4.75E-02 5.00E-02 5.07E-02 4.94E-02 4.83E-02 4.93E-02 4.97E-02 4.99E-02 5.06E-02 4.89E-02 5.00E-02 5.01E-02 70 4.76E-02 5.02E-02 5.08E-02 4.95E-02 4.84E-02 4.94E-02 4.98E-02 5.01E-02 5.06E-02 4.89E-02 4.99E-02 5.00E-02 5.06E-02 1.30E-03 5.41E-02 4.70E-02 5.01E-02 1.33E-03 5.38E-02 4.65E-02 4.98E-02 1.34E-03 5.35E-02 4.61E-02 4.92E-02 1.31E-03 5.28E-02 4.56E-02 4.94E-02 1.31E-03 5.30E-02 4.58E-02 4.92E-02 1.30E-03 5.27E-02 4.56E-02 4.93E-02 1.32E-03 5.29E-02 4.57E-02 5.08E-02 5.04E-02 5.02E-02 4.97E-02 4.97E-02 4.97E-02 4.98E-02 6.47E-04 6.84E-04 6.61E-04 6.54E-04 6.90E-04 6.61E-04 6.58E-04 5.25E-02 5.23E-02 5.20E-02 5.15E-02 5.16E-02 5.15E-02 5.16E-02 4.90E-02 4.85E-02 4.84E-02 4.79E-02 4.78E-02 4.79E-02 4.79E-02 1.25E-02 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03 8.00E-03 PASS PASS PASS PASS PASS PASS PASS An ISO 9001:2008 and DSCC Certified Company 195 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The ELDRS testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance from the source. Samples of the RH1498MW Dual Precision Op Amp described in this report were irradiated biased with a split 25V supply and unbiased (all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. In addition, all units-under-test received a 24hr room temperature and 168hr 100°C anneal, using the same bias conditions as the radiation exposure. The parametric data was obtained as read and record and all the raw data plus an attributes summary are contained in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units irradiated without electrical bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Using the conditions stated above, the RH1498MW Dual Precision Op Amp (from the lot date code identified on the first page of this test report) passed the enhanced low dose rate sensitivity test to 50krad(Si) with all parameters remaining within their pre- and/or post-radiation specification limits. Note that the data for the units-under-test irradiated in the unbiased condition and the KTL statistics presented in this report are for reference only and are not used for the determination of “PASS/FAIL” for the lot. Further, the data in this report can be analyzed along with the low dose rate report titled “Total Ionizing Dose (TID) Testing of the RH1498MW Dual Precision Op Amp for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. An ISO 9001:2008 and DSCC Certified Company 196 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of device-under-test to show part markings An ISO 9001:2008 and DSCC Certified Company 197 ELDRS Report 09-579 100408 R1.0 Appendix B: TID Bias Connections Biased Samples: Pin Function Connection / Bias 1 OUT A To Pin 2 via 5kΩ & 40pF, in Parallel 2 -INPUT A To Pin 1 via 5kΩ & 40pF, in Parallel 3 +INPUT A To 8V via 5kΩ Resistor 4 NC NC 5 V- To -15V using 0.1μF Decoupling 6 NC NC 7 +INPUT B To 8V via 5kΩ Resistor 8 -INPUT B To Pin 9 via 5kΩ & 40pF, in Parallel 9 OUT B To Pin 8 via 5kΩ & 40pF, in Parallel 10 V+ To +15V using 0.1μF Decoupling Unbiased Samples: Pin Function Connection / Bias 1 OUT A GND 2 -INPUT A GND 3 +INPUT A GND 4 NC GND 5 V- GND 6 NC GND 7 +INPUT B GND 8 -INPUT B GND 9 OUT B GND 10 V+ GND An ISO 9001:2008 and DSCC Certified Company 198 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION, RH1498M Datasheet. Figure B.2. W package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY CORPORATION RH1498M Datasheet. An ISO 9001:2008 and DSCC Certified Company 199 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1498 DUT board. The measured parameters and test conditions are shown in Tables C.1 (VS=±15V) and C.2 (VS=5V). A listing of the measurement precision/resolution for each parameter is shown in Tables C.3 (VS=±15V) and C.4 (VS=5V). The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS-2020. To generate the precision/resolution shown in Table C.4 through C.6, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DSCC Certified Company 200 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.1. Measured parameters and test conditions for VS=±15V. TEST DESCRIPTION Positive Supply Current Negative Supply Current Input Offset Voltage (Op Amp 1-2) Input Offset Current (Op Amp 1-2) + Input Bias Current (Op Amp 1-2) - Input Bias Current (Op Amp 1-2) Input Offset Voltage (Op Amp 1-2) Input Offset Current (Op Amp 1-2) + Input Bias Current (Op Amp 1-2) - Input Bias Current (Op Amp 1-2) Input Offset Voltage (Op Amp 1-2) Input Offset Current (Op Amp 1-2) + Input Bias Current (Op Amp 1-2) - Input Bias Current (Op Amp 1-2) Large Signal Voltage Gain (Op Amp 1-2) Large Signal Voltage Gain (Op Amp 1-2) CMRR (Op Amp 1-2) CMRR Matching PSRR (Op Amp 1-2) PSRR Matching Output Voltage Swing High (Op Amp 1-2) Output Voltage Swing High (Op Amp 1-2) Output Voltage Swing High (Op Amp 1-2) Output Voltage Swing Low (Op Amp 1-2) Output Voltage Swing Low (Op Amp 1-2) Output Voltage Swing Low (Op Amp 1-2) +VS Short-Circuit Current (Op Amp 1-2) -VS Short-Circuit Current (Op Amp 1-2) TEST CONDITIONS V+=15V and V-=-15V V+=15V and V-=-15V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=-15V V+=15V, V-=-15V and VCM=-15V V+=15V, V-=-15V and VCM=-15V V+=15V, V-=-15V and VCM=-15V RL = 10kΩ, VO = ±14.5V RL = 2kΩ, VO = ±10V VS=±15V, VCM=±15V VS=±15V, VCM=±15V VS=±2V to VS=±16V VS=±2V to VS=±16V VS=±15V, No Load VS=±15V, ISINK=1mA VS=±15V, ISINK=10mA VS=±15V, No Load VS=±15V, ISINK=1mA VS=±15V, ISINK=10mA VS=±15V VS=±15V An ISO 9001:2008 and DSCC Certified Company 201 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters and test conditions for VS=5V. TEST DESCRIPTION TEST CONDITIONS Positive Supply Current V+=5V and V-=0V Negative Supply Current V+=5V and V-=0V Input Offset Voltage (Op Amp 1-2) V+=5V, V-=0V and VCM=0V Input Offset Current (Op Amp 1-2) V+=5V, V-=0V and VCM=0V + Input Bias Current (Op Amp 1-2) V+=5V, V-=0V and VCM=0V - Input Bias Current (Op Amp 1-2) V+=5V, V-=0V and VCM=0V Input Offset Voltage (Op Amp 1-2) V+=5V, V-=0V and VCM=5V Input Offset Current (Op Amp 1-2) V+=5V, V-=0V and VCM=5V + Input Bias Current (Op Amp 1-2) V+=5V, V-=0V and VCM=5V - Input Bias Current (Op Amp 1-2) V+=5V, V-=0V and VCM=5V Large Signal Voltage Gain (Op Amp 1-2) RL = 10kΩ, VO=75mV to 4.8V CMRR (Op Amp 1-2) VS=5V, VCM=0-5V CMRR Matching VS=5V, VCM=0-5V PSRR (Op Amp 1-2) VS=4.5V to VS=12V PSRR Matching VS=4.5V to VS=12V Output Voltage Swing High (Op Amp 1-2) VS=5V, No Load Output Voltage Swing High (Op Amp 1-2) VS=5V, ISINK=1mA Output Voltage Swing High (Op Amp 1-2) VS=5V, ISINK=2.5mA Output Voltage Swing Low (Op Amp 1-2) VS=5V, No Load Output Voltage Swing Low (Op Amp 1-2) VS=5V, ISINK=1mA Output Voltage Swing Low (Op Amp 1-2) VS=5V, ISINK=2.5mA +VS Short-Circuit Current (Op Amp 1-2) VS=5V -VS Short-Circuit Current (Op Amp 1-2) VS=5V An ISO 9001:2008 and DSCC Certified Company 202 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table C.3. Measured parameters, pre-irradiation specifications and measurement resolutions for VS=±15V. Pre-Irradiation Measurement Specification Resolution/Precision Measured Parameter Positive Supply Current Negative Supply Current Input Offset Voltage Input Offset Current + Input Bias Current - Input Bias Current Large Signal Voltage Gain (10kΩ Load) Large Signal Voltage Gain (2kΩ Load) Common Mode Rejection Ratio Common Mode Rejection Ratio Matching Power Supply Rejection Ratio Power Supply Rejection Ratio Matching Output Voltage Swing High (No Load) Output Voltage Swing High (ISINK=1mA) Output Voltage Swing High (ISINK=10mA) Output Voltage Swing Low (No Load) Output Voltage Swing Low (ISINK=1mA) Output Voltage Swing Low (ISINK=10mA) +VS Short Circuit Current -VS Short Circuit Current 5mA -5mA ±800μV ±70nA ±715nA ±715nA 1000V/mV 500V/mV 90dB 84dB 90dB 83dB 10mV 150mV 800mV 30mV 100mV 500mV ±15mA ±15mA ± 1.36E-04A ± 1.28E-04A ± 3.66E-05V ± 1.39E-09A ± 2.12E-08A ± 1.75E-08A ± 6.74E+02V/mV ± 1.12E+02V/mV ± 4.88E-01dB ± 1.13E-01dB ± 8.81E-01dB ± 2.52E-01dB ± 1.67E-04V ± 1.06E-03V ± 4.71E-03V ± 5.82E-04V ± 8.60E-04V ± 3.67E-03V ± 1.28E-03A ± 1.75E-03A An ISO 9001:2008 and DSCC Certified Company 203 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 Table C.4. Measured parameters, pre-irradiation specifications and measurement resolutions for VS=5V. Pre-Irradiation Measurement Specification Resolution/Precision Measured Parameter Positive Supply Current Negative Supply Current Input Offset Voltage Input Offset Current + Input Bias Current - Input Bias Current Large Signal Voltage Gain (10kΩ Load) Common Mode Rejection Ratio Common Mode Rejection Ratio Matching Power Supply Rejection Ratio Power Supply Rejection Ratio Matching Output Voltage Swing High (No Load) Output Voltage Swing High (ISINK=1mA) Output Voltage Swing High (ISINK=2.5mA) Output Voltage Swing Low (No Load) Output Voltage Swing Low (ISINK=1mA) Output Voltage Swing Low (ISINK=2.5mA) +VS Short Circuit Current -VS Short Circuit Current 4.4mA -4.4mA ±800μV ±65nA ±650nA ±650nA 600V/mV 76dB 75dB 88dB 82dB 10mV 150mV 250mV 30mV 100mV 200mV ±12.5mA ±12.5mA ± 8.71E-06A ± 8.71E-06A ± 2.67E-06V ± 1.08E-10A ± 3.04E-09A ± 3.27E-09A ± 2.43E+02V/mV ± 2.24E-01dB ± 8.27E-02dB ± 4.72E-01dB ± 2.71E-01dB ± 2.28E-04V ± 2.53E-04V ± 4.10E-04V ± 1.21E-04V ± 1.70E-04V ± 2.53E-04V ± 3.34E-05A ±9.72E-05A An ISO 9001:2008 and DSCC Certified Company 204 ELDRS Report 09-579 100408 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix D: List of Figures used in Section 5 (Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current (A) Negative Supply Current (A) Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) Common Mode Rejection Ratio Matching @ +/- 15 V, VCM=+/- 15 V (dB) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) Power Supply Rejection Ratio Matching @ +/- 2 V to +/- 16 V (dB) Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) An ISO 9001:2008 and DSCC Certified Company 205 ELDRS Report 09-579 100408 R1.0 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 5.63 5.64 5.65 5.66 5.67 5.68 5.69 5.70 5.71 5.72 5.73 5.74 5.75 5.76 5.77 5.78 5.79 5.80 Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) Positive Short-Circuit Current @ +/- 15 V #1 (A) Positive Short-Circuit Current @ +/- 15 V #2 (A) Negative Short-Circuit Current @ +/- 15 V #1 (A) Negative Short-Circuit Current @ +/- 15 V #2 (A) Positive Supply Current @ 5V (A) Negative Supply Current @ 5V (A) Input Offset Voltage @ 5V, VCM=0V #1 (V) Input Offset Voltage @ 5V, VCM=0V #2 (V) Input Offset Current @ 5V, VCM=0V #1 (A) Input Offset Current @ 5V, VCM=0V #2 (A) Positive Input Bias Current @ 5V, VCM=0V #1 (A) Positive Input Bias Current @ 5V, VCM=0V #2 (A) Negative Input Bias Current @ 5V, VCM=0V #1 (A) Negative Input Bias Current @ 5V, VCM=0V #2 (A) Input Offset Voltage @ 5V, VCM=5V #1 (V) Input Offset Voltage @ 5V, VCM=5V #2 (V) Input Offset Current @ 5V, VCM=5V #1 (A) Input Offset Current @ 5V, VCM=5V #2 (A) Positive Input Bias Current @ 5V, VCM=5V #1 (A) Positive Input Bias Current @ 5V, VCM=5V #2 (A) Negative Input Bias Current @ 5V, VCM=5V #1 (A) Negative Input Bias Current @ 5V, VCM=5V #2 (A) Large Signal Voltage Gain @ 5V #1 (V/mV) Large Signal Voltage Gain @ 5V #2 (V/mV) Common Mode Rejection Ratio @ 5V #1 (dB) Common Mode Rejection Ratio @ 5V #2 (dB) Common Mode Rejection Ratio Matching @ 5V (dB) Power Supply Rejection Ratio @ 4.5V-12V #1 (dB) Power Supply Rejection Ratio @ 4.5V-12V #2 (dB) Power Supply Rejection Ratio Matching @ 4.5V-12V (dB) Output Voltage Swing High IL= 0mA @ 5V #1 (V) Output Voltage Swing High IL= 0mA @ 5V #2 (V) An ISO 9001:2008 and DSCC Certified Company 206 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 09-579 100408 R1.0 5.81 5.82 5.83 5.84 5.85 5.86 5.87 5.88 5.89 5.90 5.91 5.92 5.93 5.94 Output Voltage Swing High IL= 1mA @ 5V #1 (V) Output Voltage Swing High IL= 1mA @ 5V #2 (V) Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) Output Voltage Swing Low IL= 0mA @ 5V #1 (V) Output Voltage Swing Low IL= 0mA @ 5V #2 (V) Output Voltage Swing Low IL= 1mA @ 5V #1 (V) Output Voltage Swing Low IL= 1mA @ 5V #2 (V) Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) Positive Short-Circuit Current @ 5V #1 (A) Positive Short-Circuit Current @ 5V #2 (A) Negative Short-Circuit Current @ 5V #1 (A) Negative Short-Circuit Current @ 5V #2 (A) An ISO 9001:2008 and DSCC Certified Company 207 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800