ELDRS Report_RH1086MK_Fab Lot W10913024.1.pdf

ELDRS Report
10-006 100412 R1.3
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1086MK Low Dropout Positive Adjustable Regulator for Linear
Technology
Customer: Linear Technology, PO# 54886L
RAD Job Number: 10-006
Part Type Tested: Linear Technology RH1086MK Low Dropout Positive Adjustable Regulator
Traceability Information: Fab lot# W10913024.1, Wafer# 17, Assembly lot: #540912.1. Information obtained
from Linear Technology PO#54886L. Date code marking on the package is 0941A, see Appendix A for a
photograph of the device and part markings.
Quantity of Units: 12 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 2 control
units. Serial numbers 4, 8, 11, 14, and 17 were biased during irradiation, serial numbers 19, 41, 60, 62, and 65
were unbiased during irradiation (all pins tied to ground) and serial numbers 149 and 153 were used as the
controls. See Appendix B for the radiation bias connection table.
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware: LTS2020 Tester, 2101 Family Board, 0606 Fixture and RH1086K BGSS-020602 DUT Board
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5.
Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C±6°C
per MIL-STD-883.
Low Dose Rate Test Result: Units passed with only minor degradation to the VOUT
parameters and no significant degradation to any other measured parameter.
Further, the units do not exhibit ELDRS as defined in the current test method.
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ELDRS Report
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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ELDRS Report
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the
device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from
approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4meters.
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ELDRS Report
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Radiation Assured Devices
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3.0. Radiation Test Conditions
The RH1086MK low dropout positive adjustable regulator described in this final report was irradiated
under two different conditions, one when biased with a 30V single sided supply, and one when unbiased
with all pins tied to ground. See the TID Bias Table in Appendix A for the full bias circuits. In our
opinion these bias circuits satisfy the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and
Loading Conditions which states “The bias applied to the test devices shall be selected to produce the
greatest radiation induced damage or the worst-case damage for the intended application, if known.
While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias
current or maximum output load current) exhibit more degradation with 0 V bias.”
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of
each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose
exposure within two hours from the end of the previous radiation increment. The ELDRS bias board
was positioned in the Co-60 cell to provide the required maximum of 10mrad(Si)/s and was located
inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G
TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall
be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered
radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required.
This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as
CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when
the source is changed, or (3) when the orientation or configuration of the source, container, or testfixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the
device-irradiation container at the approximate test-device position. If it can be demonstrated that low
energy scattered radiation is small enough that it will not cause dosimetry errors due to dose
enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10mrad(Si)/s with a precision of ±5%.
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ELDRS Report
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Radiation Assured Devices
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4.0. Tested Parameters
During the radiation lot acceptance testing the following electrical parameters were measured pre- and
post-irradiation:
1. Reference Voltage, VOUT1
2. Reference Voltage, VOUT2
3. Reference Voltage, VOUT3
4. Reference Voltage, VOUT4
5. Reference Voltage, VOUT5
6. Line Regulation, LineReg
7. Load Regulation, LoadReg
8. Adjust Pin Current, IADJ1
9. Adjust Pin Current, IADJ2
10. Adjust Pin Current, IADJ3
11. Adjust Pin Current, IADJ4
12. Adjust Pin Current, IADJ5
13. Adjust Pin Current, IADJ6
14. Adjust Pin Current Change, ΔIADJ1
15. Adjust Pin Current Change, ΔIADJ2
16. Adjust Pin Current Change, ΔIADJ3
17. Adjust Pin Current Change, ΔIADJ4
18. Minimum Load Current, ILOADMIN
19. Current Limit, ILIM1
20. Current Limit, ILIM2
21. Dropout Voltage, VDROPOUT
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used is 2.742 per MIL
HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the low dose rate test: following the radiation exposure each of the 5 pieces irradiated
under electrical bias shall pass the specification value. The units irradiated without electrical bias and
the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated under
electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
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Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the low dose rate report titled “Total
Ionizing Dose (TID) Testing of the RH1086MK Low Dropout Positive Adjustable Regulator for Linear
Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1086MK Low Dropout Positive Adjustable Regulator (from
the lot date code identified on the first page of this test report) passed the low dose rate test with only
minor degradation to the VOUT parameters. Note that the post-irradiation specification limits as defined
by Linear Technology for both the maximum and minimum VOUT1 levels are reduced with increasing
dose, keeping a somewhat constant maximum to minimum spread. For example, the maximum VOUT1
specification pre-irradiation is 1.262V and incrementally decreases to 1.241V at 200krad(Si). Therefore,
if a particular lot of RH1086 voltage regulators show little or no degradation to VOUT1 with total dose, it
is likely to “fail” by exceeding the maximum post-irradiation specification. The remaining VOUT
parameters (VOUT2-VOUT5) use a slightly increased post-radiation limit for the maximum voltage level,
thus avoiding the “fail” observed on VOUT1 if little or no degradation is observed. Note that the data for
the units-under-test irradiated in the unbiased condition and the KTL statistics presented in this report
are for reference only and are not used for the determination of “PASS/FAIL” for the lot.
Figures 5.1 through 5.21 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 – 5.21 show the corresponding raw data for each of these parameters. In these data plots the
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ELDRS Report
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Radiation Assured Devices
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(719) 531-0800
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change
during the anneal.
As seen clearly in these figures, the pre- and post-irradiation data are well within the specification even
after application of the KTL statistics and the control units, as expected, show no significant changes to
any of the parameters throughout the course of the measurements. Therefore we can conclude that any
observed degradation was due to the radiation exposure and not drift in the test equipment.
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Reference Voltage 1 VDIFF=3V IL=10mA (V)
1.265
1.260
1.255
1.250
1.245
1.240
1.235
1.230
1.225
1.220
0
10
20
30
40
50
24-Hr
60
Anneal
Total Dose (krad(Si))
Figure 5.1. Plot of Reference Voltage 1 VDIFF=3V IL=10mA (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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168-Hr
70
Anneal
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ELDRS Report
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Table 5.1. Raw data for Reference Voltage 1 VDIFF=3V IL=10mA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 1
VDIFF=3V IL=10mA (V)
24-hr
Anneal
Total Dose (krad(Si))
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.251
1.255
1.249
1.251
1.256
1.248
1.255
1.253
1.254
1.248
1.256
1.249
10
1.248
1.253
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.256
1.248
20
1.247
1.252
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.255
1.249
30
1.246
1.251
1.245
1.246
1.252
1.246
1.253
1.250
1.252
1.247
1.256
1.248
50
1.243
1.250
1.243
1.243
1.251
1.243
1.251
1.248
1.251
1.244
1.255
1.247
60
1.244
1.250
1.244
1.244
1.251
1.245
1.252
1.249
1.252
1.246
1.256
1.249
168-hr
Anneal
70
1.244
1.250
1.244
1.244
1.251
1.245
1.252
1.249
1.252
1.246
1.255
1.248
Biased Statistics
Average Biased
1.252
1.250
1.250
1.248
1.246
1.247
1.247
Std Dev Biased
2.97E-03
3.24E-03
3.21E-03
3.24E-03
4.12E-03
3.58E-03
3.58E-03
Ps90%/90% (+KTL) Biased
1.261
1.259
1.258
1.257
1.257
1.256
1.256
Ps90%/90% (-KTL) Biased
1.244
1.241
1.241
1.239
1.235
1.237
1.237
Un-Biased Statistics
Average Un-Biased
1.252
1.250
1.250
1.250
1.247
1.249
1.249
Std Dev Un-Biased
3.36E-03
3.03E-03
3.03E-03
3.05E-03
3.78E-03
3.27E-03
3.27E-03
Ps90%/90% (+KTL) Un-Biased
1.261
1.259
1.259
1.258
1.258
1.258
1.258
Ps90%/90% (-KTL) Un-Biased
1.242
1.242
1.242
1.241
1.237
1.240
1.240
Specification MIN
1.238
1.234
1.230
1.230
1.225
1.225
1.225
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
1.262
1.258
1.257
1.257
1.253
1.253
1.253
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Reference Voltage 2 VDIFF=1.5V IL=10mA (V)
1.280
1.270
1.260
1.250
1.240
1.230
1.220
1.210
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.2. Plot of Reference Voltage 2 VDIFF=1.5V IL=10mA (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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Table 5.2. Raw data for Reference Voltage 2 VDIFF=1.5V IL=10mA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 2
VDIFF=1.5V IL=10mA (V)
24-hr
Anneal
Total Dose (krad(Si))
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.250
1.255
1.249
1.251
1.256
1.248
1.255
1.253
1.254
1.248
1.256
1.248
10
1.248
1.253
1.247
1.248
1.254
1.246
1.253
1.251
1.253
1.247
1.255
1.248
20
1.248
1.253
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.256
1.248
30
1.246
1.251
1.245
1.246
1.252
1.246
1.252
1.250
1.252
1.246
1.255
1.248
50
1.243
1.249
1.243
1.243
1.250
1.243
1.250
1.247
1.251
1.244
1.255
1.247
60
1.244
1.250
1.244
1.244
1.251
1.245
1.252
1.248
1.252
1.246
1.256
1.249
168-hr
Anneal
70
1.244
1.250
1.244
1.244
1.251
1.245
1.252
1.249
1.252
1.246
1.255
1.248
Biased Statistics
Average Biased
1.252
1.250
1.250
1.248
1.246
1.247
1.247
Std Dev Biased
3.11E-03
3.24E-03
3.24E-03
3.24E-03
3.58E-03
3.58E-03
3.58E-03
Ps90%/90% (+KTL) Biased
1.261
1.259
1.259
1.257
1.255
1.256
1.256
Ps90%/90% (-KTL) Biased
1.244
1.241
1.241
1.239
1.236
1.237
1.237
Un-Biased Statistics
Average Un-Biased
1.252
1.250
1.250
1.249
1.247
1.249
1.249
Std Dev Un-Biased
3.36E-03
3.32E-03
3.03E-03
3.03E-03
3.54E-03
3.29E-03
3.27E-03
Ps90%/90% (+KTL) Un-Biased
1.261
1.259
1.259
1.258
1.257
1.258
1.258
Ps90%/90% (-KTL) Un-Biased
1.242
1.241
1.242
1.241
1.237
1.240
1.240
Specification MIN
1.225
1.220
1.219
1.215
1.215
1.215
1.215
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
1.270
1.275
1.275
1.275
1.275
1.275
1.275
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Reference Voltage 3 VDIFF=1.5V IL=1.5A (V)
1.280
1.270
1.260
1.250
1.240
1.230
1.220
1.210
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.3. Plot of Reference Voltage 3 VDIFF=1.5V IL=1.5A (V) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
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Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.3. Raw data for Reference Voltage 3 VDIFF=1.5V IL=1.5A (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 3
VDIFF=1.5V IL=1.5A (V)
24-hr
Anneal
Total Dose (krad(Si))
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.251
1.255
1.248
1.250
1.257
1.247
1.255
1.253
1.254
1.247
1.255
1.248
10
1.248
1.252
1.246
1.248
1.253
1.246
1.253
1.251
1.252
1.246
1.255
1.248
20
1.247
1.252
1.246
1.247
1.253
1.246
1.252
1.250
1.253
1.246
1.254
1.248
30
1.246
1.250
1.244
1.245
1.251
1.245
1.252
1.249
1.252
1.246
1.255
1.248
50
1.243
1.248
1.241
1.242
1.250
1.243
1.250
1.247
1.249
1.243
1.254
1.246
60
1.244
1.249
1.243
1.243
1.251
1.243
1.251
1.247
1.251
1.245
1.255
1.247
168-hr
Anneal
70
1.244
1.247
1.243
1.243
1.250
1.243
1.251
1.249
1.251
1.245
1.255
1.248
Biased Statistics
Average Biased
1.252
1.249
1.249
1.247
1.245
1.246
1.245
Std Dev Biased
3.70E-03
2.97E-03
3.24E-03
3.11E-03
3.96E-03
3.74E-03
3.05E-03
Ps90%/90% (+KTL) Biased
1.262
1.258
1.258
1.256
1.256
1.256
1.254
Ps90%/90% (-KTL) Biased
1.242
1.241
1.240
1.239
1.234
1.236
1.237
Un-Biased Statistics
Average Un-Biased
1.251
1.250
1.249
1.249
1.246
1.247
1.248
Std Dev Un-Biased
3.90E-03
3.36E-03
3.29E-03
3.27E-03
3.29E-03
3.58E-03
3.63E-03
Ps90%/90% (+KTL) Un-Biased
1.262
1.259
1.258
1.258
1.255
1.257
1.258
Ps90%/90% (-KTL) Un-Biased
1.241
1.240
1.240
1.240
1.237
1.238
1.238
Specification MIN
1.225
1.220
1.219
1.215
1.215
1.215
1.215
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
1.270
1.275
1.275
1.275
1.275
1.275
1.275
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Reference Voltage 4 VDIFF=15V IL=10mA (V)
1.280
1.270
1.260
1.250
1.240
1.230
1.220
1.210
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.4. Plot of Reference Voltage 4 VDIFF=15V IL=10mA (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.4. Raw data for Reference Voltage 4 VDIFF=15V IL=10mA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 4
VDIFF=15V IL=10mA (V)
24-hr
Anneal
Total Dose (krad(Si))
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.250
1.255
1.249
1.251
1.256
1.249
1.255
1.253
1.255
1.248
1.256
1.248
10
1.248
1.253
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.256
1.247
20
1.248
1.252
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.255
1.248
30
1.245
1.251
1.245
1.246
1.252
1.246
1.253
1.250
1.252
1.246
1.255
1.248
50
1.244
1.250
1.243
1.244
1.251
1.243
1.251
1.247
1.251
1.245
1.255
1.247
60
1.244
1.250
1.244
1.244
1.251
1.245
1.252
1.249
1.252
1.246
1.256
1.249
168-hr
Anneal
70
1.244
1.250
1.244
1.244
1.251
1.245
1.252
1.250
1.252
1.246
1.255
1.248
Biased Statistics
Average Biased
1.252
1.250
1.250
1.248
1.246
1.247
1.247
Std Dev Biased
3.11E-03
3.24E-03
3.03E-03
3.42E-03
3.78E-03
3.58E-03
3.58E-03
Ps90%/90% (+KTL) Biased
1.261
1.259
1.258
1.257
1.257
1.256
1.256
Ps90%/90% (-KTL) Biased
1.244
1.241
1.241
1.238
1.236
1.237
1.237
Un-Biased Statistics
Average Un-Biased
1.252
1.250
1.250
1.249
1.247
1.249
1.249
Std Dev Un-Biased
3.32E-03
3.03E-03
3.03E-03
3.29E-03
3.58E-03
3.27E-03
3.32E-03
Ps90%/90% (+KTL) Un-Biased
1.261
1.259
1.259
1.258
1.257
1.258
1.258
Ps90%/90% (-KTL) Un-Biased
1.243
1.242
1.242
1.240
1.238
1.240
1.240
Specification MIN
1.225
1.220
1.219
1.215
1.215
1.215
1.215
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
1.270
1.275
1.275
1.275
1.275
1.275
1.275
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Reference Voltage 5 VDIFF=15V IL=500mA (V)
1.280
1.270
1.260
1.250
1.240
1.230
1.220
1.210
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.5. Plot of Reference Voltage 5 VDIFF=15V IL=500mA (V) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.5. Raw data for Reference Voltage 5 VDIFF=15V IL=500mA (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 5
VDIFF=15V IL=500mA (V)
24-hr
Anneal
Total Dose (krad(Si))
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.250
1.255
1.249
1.250
1.256
1.249
1.255
1.253
1.254
1.248
1.256
1.249
10
1.247
1.253
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.255
1.248
20
1.248
1.252
1.247
1.248
1.254
1.247
1.253
1.251
1.253
1.247
1.256
1.247
30
1.246
1.251
1.246
1.246
1.252
1.246
1.253
1.250
1.252
1.246
1.255
1.248
50
1.243
1.250
1.244
1.243
1.250
1.243
1.250
1.247
1.251
1.244
1.255
1.248
60
1.244
1.250
1.244
1.244
1.251
1.244
1.252
1.248
1.252
1.245
1.256
1.249
168-hr
Anneal
70
1.245
1.250
1.244
1.244
1.251
1.246
1.252
1.249
1.253
1.246
1.255
1.248
Biased Statistics
Average Biased
1.252
1.250
1.250
1.248
1.246
1.247
1.247
Std Dev Biased
3.24E-03
3.42E-03
3.03E-03
3.03E-03
3.67E-03
3.58E-03
3.42E-03
Ps90%/90% (+KTL) Biased
1.261
1.259
1.258
1.257
1.256
1.256
1.256
Ps90%/90% (-KTL) Biased
1.243
1.240
1.241
1.240
1.236
1.237
1.237
Un-Biased Statistics
Average Un-Biased
1.252
1.250
1.250
1.249
1.247
1.248
1.249
Std Dev Un-Biased
3.11E-03
3.03E-03
3.03E-03
3.29E-03
3.54E-03
3.77E-03
3.27E-03
Ps90%/90% (+KTL) Un-Biased
1.260
1.259
1.259
1.258
1.257
1.259
1.258
Ps90%/90% (-KTL) Un-Biased
1.243
1.242
1.242
1.240
1.237
1.238
1.240
Specification MIN
1.225
1.220
1.219
1.215
1.215
1.215
1.215
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
1.270
1.275
1.275
1.275
1.275
1.275
1.275
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Line Regulation VDIFF=1.5-15V IL=10mA (%)
3.00E-01
2.00E-01
1.00E-01
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.6. Plot of Line Regulation VDIFF=1.5-15V IL=10mA (%) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.6. Raw data for Line Regulation VDIFF=1.5-15V IL=10mA (%) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Line Regulation
VDIFF=1.5-15V IL=10mA (%)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Total Dose (krad(Si))
0
7.00E-03
0.00E+00
1.20E-02
3.00E-03
-8.00E-03
1.00E-03
-9.00E-03
5.00E-03
0.00E+00
3.00E-03
-1.10E-02
-1.60E-02
10
-1.80E-02
-7.00E-03
-1.20E-02
-1.20E-02
-1.10E-02
1.10E-02
-8.00E-03
-9.00E-03
-4.00E-03
-5.00E-03
1.00E-03
-1.30E-02
20
3.00E-03
-1.70E-02
-4.00E-03
-3.10E-02
-1.00E-03
-2.30E-02
8.00E-03
-1.10E-02
-1.70E-02
-1.10E-02
4.00E-03
4.00E-03
30
-2.00E-02
-1.50E-02
1.00E-03
-2.00E-02
-1.10E-02
-2.80E-02
-2.70E-02
-3.00E-03
-1.60E-02
-1.20E-02
-3.00E-03
-1.60E-02
50
-1.90E-02
-2.00E-02
-2.20E-02
-1.50E-02
-1.20E-02
-2.20E-02
-2.20E-02
-2.00E-02
-2.40E-02
-1.80E-02
-5.00E-03
-1.60E-02
24-hr
Anneal
168-hr
Anneal
60
-1.60E-02
-3.00E-03
-1.00E-03
-5.00E-03
-4.00E-03
-5.00E-02
-2.80E-02
-1.30E-02
-7.00E-03
-3.00E-03
0.00E+00
-9.00E-03
70
-1.20E-02
-8.00E-03
-2.40E-02
-3.20E-02
-2.00E-02
-2.30E-02
-2.20E-02
1.00E-03
1.10E-02
-1.90E-02
-9.00E-03
3.00E-03
Biased Statistics
Average Biased
2.80E-03 -1.20E-02 -1.00E-02 -1.30E-02 -1.76E-02 -5.80E-03 -1.92E-02
Std Dev Biased
7.53E-03
3.94E-03
1.39E-02
8.69E-03
4.04E-03
5.89E-03
9.55E-03
Ps90%/90% (+KTL) Biased
2.34E-02 -1.20E-03
2.82E-02
1.08E-02 -6.53E-03
1.04E-02
6.99E-03
Ps90%/90% (-KTL) Biased
-1.78E-02 -2.28E-02 -4.82E-02 -3.68E-02 -2.87E-02 -2.20E-02 -4.54E-02
Un-Biased Statistics
Average Un-Biased
0.00E+00 -3.00E-03 -1.08E-02 -1.72E-02 -2.12E-02 -2.02E-02 -1.04E-02
Std Dev Un-Biased
5.39E-03
8.09E-03
1.16E-02
1.05E-02
2.28E-03
1.92E-02
1.55E-02
Ps90%/90% (+KTL) Un-Biased
1.48E-02
1.92E-02
2.11E-02
1.16E-02 -1.49E-02
3.24E-02
3.20E-02
Ps90%/90% (-KTL) Un-Biased
-1.48E-02 -2.52E-02 -4.27E-02 -4.60E-02 -2.75E-02 -7.28E-02 -5.28E-02
Specification MIN
-2.00E-01 -2.00E-01 -2.10E-01 -2.30E-01 -2.30E-01 -2.30E-01 -2.30E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Specification MAX
2.00E-01
2.00E-01
2.10E-01
2.30E-01
2.30E-01
2.30E-01
2.30E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Load Regulation VDIFF=3V IL=10mA-1.5A (%)
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
-1.00E-01
-2.00E-01
-3.00E-01
-4.00E-01
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.7. Plot of Load Regulation VDIFF=3V IL=10mA-1.5A (%) versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.7. Raw data for Load Regulation VDIFF=3V IL=10mA-1.5A (%) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Load Regulation
VDIFF=3V IL=10mA-1.5A (%)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.20E-02
1.03E-01
2.40E-02
7.00E-03
2.10E-02
4.30E-02
5.10E-02
3.10E-02
9.40E-02
1.00E-03
9.80E-02
5.40E-02
10
3.60E-02
5.10E-02
4.30E-02
2.20E-02
1.20E-02
5.40E-02
4.30E-02
4.20E-02
2.30E-02
1.16E-01
5.80E-02
9.00E-03
20
1.20E-02
5.50E-02
5.30E-02
5.80E-02
3.60E-02
2.80E-02
6.40E-02
3.00E-02
4.70E-02
6.90E-02
8.30E-02
4.70E-02
30
7.00E-02
1.39E-01
2.80E-02
5.10E-02
4.80E-02
1.11E-01
9.80E-02
8.90E-02
3.10E-02
2.30E-02
5.50E-02
5.30E-02
50
5.80E-02
5.90E-02
5.50E-02
6.20E-02
2.60E-02
5.50E-02
6.10E-02
6.90E-02
6.10E-02
1.18E-01
5.50E-02
1.01E-01
60
3.90E-02
3.50E-02
3.70E-02
1.08E-01
4.70E-02
1.80E-02
4.70E-02
5.90E-02
8.50E-02
1.90E-02
3.60E-02
4.70E-02
70
9.60E-02
6.30E-02
6.50E-02
6.00E-02
3.80E-02
4.30E-02
5.00E-02
1.20E-02
6.60E-02
3.20E-02
3.60E-02
4.90E-02
3.54E-02
3.84E-02
1.41E-01
-6.98E-02
3.28E-02
1.58E-02
7.60E-02
-1.04E-02
4.28E-02
1.92E-02
9.55E-02
-9.92E-03
6.72E-02
4.28E-02
1.85E-01
-5.02E-02
5.20E-02
1.47E-02
9.24E-02
1.16E-02
5.32E-02
3.10E-02
1.38E-01
-3.17E-02
6.44E-02
2.07E-02
1.21E-01
7.59E-03
4.40E-02
5.56E-02
4.76E-02
7.04E-02
7.28E-02
4.56E-02
4.06E-02
3.38E-02
3.56E-02
1.88E-02
4.05E-02
2.58E-02
2.83E-02
2.02E-02
1.37E-01
1.53E-01
9.93E-02
1.81E-01
1.43E-01
1.23E-01
9.60E-02
-4.87E-02 -4.19E-02 -4.09E-03 -4.06E-02
2.19E-03 -3.20E-02 -1.48E-02
-3.00E-01 -3.00E-01 -3.00E-01 -3.00E-01 -3.00E-01 -3.00E-01 -3.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
3.00E-01
3.00E-01
3.00E-01
3.00E-01
3.00E-01
3.00E-01
3.00E-01
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Adj. Pin Current1 VDIFF=1.5V IL=10mA (A)
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.8. Plot of Adj. Pin Current1 VDIFF=1.5V IL=10mA (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.8. Raw data for Adj. Pin Current1 VDIFF=1.5V IL=10mA (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Adj. Pin Current1 VDIFF=1.5V IL=10mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.38E-05
3.27E-05
3.37E-05
3.44E-05
3.21E-05
3.39E-05
3.31E-05
3.57E-05
3.23E-05
3.17E-05
3.21E-05
3.33E-05
10
3.35E-05
3.28E-05
3.36E-05
3.46E-05
3.20E-05
3.39E-05
3.31E-05
3.54E-05
3.19E-05
3.17E-05
3.25E-05
3.37E-05
20
3.34E-05
3.28E-05
3.36E-05
3.41E-05
3.17E-05
3.35E-05
3.24E-05
3.48E-05
3.15E-05
3.15E-05
3.23E-05
3.32E-05
30
3.30E-05
3.15E-05
3.31E-05
3.33E-05
3.10E-05
3.32E-05
3.17E-05
3.43E-05
3.07E-05
3.07E-05
3.17E-05
3.31E-05
50
3.27E-05
3.10E-05
3.28E-05
3.31E-05
3.08E-05
3.28E-05
3.17E-05
3.40E-05
3.06E-05
3.07E-05
3.13E-05
3.31E-05
60
3.33E-05
3.24E-05
3.32E-05
3.34E-05
3.15E-05
3.31E-05
3.22E-05
3.43E-05
3.09E-05
3.11E-05
3.17E-05
3.31E-05
70
3.31E-05
3.19E-05
3.31E-05
3.36E-05
3.14E-05
3.32E-05
3.22E-05
3.47E-05
3.11E-05
3.10E-05
3.18E-05
3.31E-05
3.33E-05
9.24E-07
3.58E-05
3.08E-05
3.33E-05
9.72E-07
3.60E-05
3.06E-05
3.31E-05
9.30E-07
3.57E-05
3.06E-05
3.24E-05
1.04E-06
3.52E-05
2.95E-05
3.21E-05
1.10E-06
3.51E-05
2.91E-05
3.27E-05
8.14E-07
3.50E-05
3.05E-05
3.26E-05
9.27E-07
3.52E-05
3.01E-05
3.33E-05
3.32E-05
3.27E-05
3.21E-05
3.20E-05
3.23E-05
3.24E-05
1.55E-06
1.54E-06
1.42E-06
1.60E-06
1.44E-06
1.41E-06
1.56E-06
3.76E-05
3.74E-05
3.66E-05
3.65E-05
3.59E-05
3.62E-05
3.67E-05
2.91E-05
2.90E-05
2.88E-05
2.77E-05
2.80E-05
2.84E-05
2.82E-05
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Adj. Pin Current2 VDIFF=3V IL=10mA (A)
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.9. Plot of Adj. Pin Current2 VDIFF=3V IL=10mA (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.9. Raw data for Adj. Pin Current2 VDIFF=3V IL=10mA (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Adj. Pin Current2 VDIFF=3V IL=10mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.38E-05
3.28E-05
3.36E-05
3.43E-05
3.20E-05
3.37E-05
3.31E-05
3.55E-05
3.20E-05
3.17E-05
3.21E-05
3.32E-05
10
3.34E-05
3.27E-05
3.35E-05
3.46E-05
3.18E-05
3.38E-05
3.31E-05
3.53E-05
3.18E-05
3.16E-05
3.30E-05
3.37E-05
20
3.34E-05
3.26E-05
3.36E-05
3.40E-05
3.18E-05
3.35E-05
3.24E-05
3.48E-05
3.12E-05
3.15E-05
3.19E-05
3.32E-05
30
3.28E-05
3.13E-05
3.31E-05
3.33E-05
3.11E-05
3.31E-05
3.16E-05
3.44E-05
3.08E-05
3.07E-05
3.17E-05
3.30E-05
50
3.27E-05
3.11E-05
3.26E-05
3.31E-05
3.07E-05
3.31E-05
3.15E-05
3.41E-05
3.05E-05
3.07E-05
3.13E-05
3.28E-05
60
3.33E-05
3.22E-05
3.35E-05
3.36E-05
3.13E-05
3.31E-05
3.21E-05
3.45E-05
3.09E-05
3.09E-05
3.18E-05
3.31E-05
70
3.31E-05
3.18E-05
3.32E-05
3.37E-05
3.15E-05
3.33E-05
3.21E-05
3.48E-05
3.11E-05
3.09E-05
3.19E-05
3.31E-05
3.33E-05
8.85E-07
3.57E-05
3.09E-05
3.32E-05
1.03E-06
3.60E-05
3.04E-05
3.31E-05
8.76E-07
3.55E-05
3.07E-05
3.23E-05
1.04E-06
3.52E-05
2.95E-05
3.20E-05
1.06E-06
3.49E-05
2.91E-05
3.28E-05
9.91E-07
3.55E-05
3.01E-05
3.26E-05
9.71E-07
3.53E-05
3.00E-05
3.32E-05
3.31E-05
3.27E-05
3.21E-05
3.20E-05
3.23E-05
3.24E-05
1.53E-06
1.51E-06
1.48E-06
1.59E-06
1.56E-06
1.53E-06
1.61E-06
3.74E-05
3.73E-05
3.68E-05
3.65E-05
3.62E-05
3.65E-05
3.69E-05
2.90E-05
2.90E-05
2.86E-05
2.77E-05
2.77E-05
2.81E-05
2.80E-05
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Adj. Pin Current3 VDIFF=15V IL=10mA (A)
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of Adj. Pin Current3 VDIFF=15V IL=10mA (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.10. Raw data for Adj. Pin Current3 VDIFF=15V IL=10mA (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Adj. Pin Current3 VDIFF=15V IL=10mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.33E-05
3.30E-05
3.32E-05
3.39E-05
3.17E-05
3.35E-05
3.31E-05
3.53E-05
3.17E-05
3.14E-05
3.17E-05
3.32E-05
10
3.32E-05
3.21E-05
3.32E-05
3.40E-05
3.17E-05
3.36E-05
3.30E-05
3.51E-05
3.17E-05
3.14E-05
3.22E-05
3.33E-05
20
3.34E-05
3.22E-05
3.33E-05
3.37E-05
3.15E-05
3.32E-05
3.19E-05
3.46E-05
3.10E-05
3.11E-05
3.20E-05
3.31E-05
30
3.28E-05
3.12E-05
3.30E-05
3.31E-05
3.08E-05
3.31E-05
3.15E-05
3.40E-05
3.05E-05
3.03E-05
3.14E-05
3.25E-05
50
3.22E-05
3.09E-05
3.24E-05
3.31E-05
3.05E-05
3.24E-05
3.14E-05
3.39E-05
3.04E-05
3.04E-05
3.10E-05
3.23E-05
60
3.31E-05
3.18E-05
3.31E-05
3.32E-05
3.11E-05
3.31E-05
3.19E-05
3.42E-05
3.08E-05
3.08E-05
3.16E-05
3.30E-05
70
3.31E-05
3.15E-05
3.31E-05
3.33E-05
3.09E-05
3.31E-05
3.19E-05
3.46E-05
3.09E-05
3.09E-05
3.15E-05
3.31E-05
3.30E-05
8.32E-07
3.53E-05
3.07E-05
3.28E-05
9.38E-07
3.54E-05
3.03E-05
3.28E-05
9.17E-07
3.53E-05
3.03E-05
3.22E-05
1.08E-06
3.51E-05
2.92E-05
3.18E-05
1.10E-06
3.48E-05
2.88E-05
3.25E-05
9.61E-07
3.51E-05
2.98E-05
3.24E-05
1.10E-06
3.54E-05
2.94E-05
3.30E-05
3.30E-05
3.24E-05
3.19E-05
3.17E-05
3.22E-05
3.23E-05
1.56E-06
1.49E-06
1.53E-06
1.64E-06
1.49E-06
1.48E-06
1.57E-06
3.73E-05
3.70E-05
3.66E-05
3.64E-05
3.58E-05
3.62E-05
3.66E-05
2.87E-05
2.89E-05
2.82E-05
2.74E-05
2.76E-05
2.81E-05
2.79E-05
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Adj. Pin Current4 VDIFF=1.5V IL=1.5A (A)
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.11. Plot of Adj. Pin Current4 VDIFF=1.5V IL=1.5A (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.11. Raw data for Adj. Pin Current4 VDIFF=1.5V IL=1.5A (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Adj. Pin Current4 VDIFF=1.5V IL=1.5A (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.35E-05
3.31E-05
3.35E-05
3.46E-05
3.20E-05
3.35E-05
3.31E-05
3.53E-05
3.31E-05
3.16E-05
3.20E-05
3.31E-05
10
3.38E-05
3.31E-05
3.38E-05
3.39E-05
3.18E-05
3.38E-05
3.31E-05
3.53E-05
3.16E-05
3.18E-05
3.31E-05
3.35E-05
20
3.35E-05
3.20E-05
3.33E-05
3.38E-05
3.14E-05
3.33E-05
3.20E-05
3.46E-05
3.13E-05
3.13E-05
3.18E-05
3.33E-05
30
3.31E-05
3.17E-05
3.31E-05
3.32E-05
3.10E-05
3.33E-05
3.17E-05
3.46E-05
3.11E-05
3.03E-05
3.17E-05
3.24E-05
50
3.24E-05
3.12E-05
3.22E-05
3.31E-05
3.06E-05
3.31E-05
3.14E-05
3.38E-05
3.02E-05
3.06E-05
3.11E-05
3.24E-05
60
3.31E-05
3.20E-05
3.31E-05
3.42E-05
3.16E-05
3.31E-05
3.17E-05
3.46E-05
3.11E-05
3.09E-05
3.18E-05
3.31E-05
70
3.31E-05
3.17E-05
3.31E-05
3.38E-05
3.13E-05
3.31E-05
3.20E-05
3.46E-05
3.11E-05
3.09E-05
3.17E-05
3.31E-05
3.33E-05
9.11E-07
3.58E-05
3.08E-05
3.33E-05
8.86E-07
3.57E-05
3.09E-05
3.28E-05
1.05E-06
3.57E-05
2.99E-05
3.24E-05
1.01E-06
3.52E-05
2.96E-05
3.19E-05
1.01E-06
3.46E-05
2.91E-05
3.28E-05
1.01E-06
3.56E-05
3.00E-05
3.26E-05
1.08E-06
3.55E-05
2.96E-05
3.33E-05
3.31E-05
3.25E-05
3.22E-05
3.18E-05
3.23E-05
3.23E-05
1.30E-06
1.50E-06
1.42E-06
1.72E-06
1.59E-06
1.53E-06
1.51E-06
3.69E-05
3.72E-05
3.64E-05
3.69E-05
3.62E-05
3.65E-05
3.65E-05
2.98E-05
2.90E-05
2.86E-05
2.75E-05
2.75E-05
2.81E-05
2.82E-05
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
29
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Adj. Pin Current5 VDIFF=3V IL=1.5A (A)
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.12. Plot of Adj. Pin Current5 VDIFF=3V IL=1.5A (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.12. Raw data for Adj. Pin Current5 VDIFF=3V IL=1.5A (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Adj. Pin Current5 VDIFF=3V IL=1.5A (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.35E-05
3.24E-05
3.38E-05
3.46E-05
3.16E-05
3.46E-05
3.31E-05
3.56E-05
3.20E-05
3.16E-05
3.16E-05
3.32E-05
10
3.31E-05
3.24E-05
3.38E-05
3.46E-05
3.16E-05
3.39E-05
3.31E-05
3.47E-05
3.16E-05
3.16E-05
3.24E-05
3.38E-05
20
3.31E-05
3.31E-05
3.36E-05
3.38E-05
3.17E-05
3.31E-05
3.31E-05
3.47E-05
3.17E-05
3.13E-05
3.24E-05
3.32E-05
30
3.31E-05
3.13E-05
3.31E-05
3.31E-05
3.09E-05
3.31E-05
3.17E-05
3.42E-05
3.09E-05
3.06E-05
3.17E-05
3.31E-05
50
3.24E-05
3.09E-05
3.31E-05
3.31E-05
3.06E-05
3.31E-05
3.18E-05
3.42E-05
3.09E-05
3.06E-05
3.17E-05
3.31E-05
60
3.33E-05
3.31E-05
3.31E-05
3.33E-05
3.16E-05
3.31E-05
3.18E-05
3.46E-05
3.06E-05
3.09E-05
3.16E-05
3.31E-05
70
3.31E-05
3.17E-05
3.31E-05
3.38E-05
3.13E-05
3.31E-05
3.24E-05
3.46E-05
3.10E-05
3.09E-05
3.31E-05
3.31E-05
3.32E-05
1.16E-06
3.64E-05
3.00E-05
3.31E-05
1.15E-06
3.62E-05
3.00E-05
3.30E-05
8.40E-07
3.54E-05
3.07E-05
3.23E-05
1.10E-06
3.53E-05
2.93E-05
3.20E-05
1.20E-06
3.53E-05
2.87E-05
3.29E-05
6.96E-07
3.48E-05
3.10E-05
3.26E-05
1.06E-06
3.55E-05
2.97E-05
3.34E-05
3.30E-05
3.28E-05
3.21E-05
3.21E-05
3.22E-05
3.24E-05
1.69E-06
1.37E-06
1.37E-06
1.53E-06
1.52E-06
1.64E-06
1.52E-06
3.80E-05
3.68E-05
3.65E-05
3.63E-05
3.63E-05
3.67E-05
3.66E-05
2.88E-05
2.93E-05
2.90E-05
2.79E-05
2.80E-05
2.77E-05
2.82E-05
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
31
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Adj. Pin Current6 VDIFF=15V IL=500mA (A)
1.40E-04
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.13. Plot of Adj. Pin Current6 VDIFF=15V IL=500mA (A) versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground.
The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics
on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.13. Raw data for Adj. Pin Current6 VDIFF=15V IL=500mA (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Adj. Pin Current6 VDIFF=15V IL=500mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
3.35E-05
3.31E-05
3.38E-05
3.46E-05
3.24E-05
3.35E-05
3.31E-05
3.53E-05
3.24E-05
3.09E-05
3.16E-05
3.31E-05
10
3.35E-05
3.18E-05
3.31E-05
3.46E-05
3.13E-05
3.35E-05
3.24E-05
3.53E-05
3.18E-05
3.16E-05
3.17E-05
3.35E-05
20
3.32E-05
3.31E-05
3.31E-05
3.38E-05
3.20E-05
3.31E-05
3.20E-05
3.53E-05
3.11E-05
3.09E-05
3.18E-05
3.31E-05
30
3.31E-05
3.12E-05
3.31E-05
3.31E-05
3.09E-05
3.31E-05
3.17E-05
3.38E-05
3.05E-05
3.02E-05
3.17E-05
3.31E-05
50
3.24E-05
3.09E-05
3.22E-05
3.31E-05
3.09E-05
3.31E-05
3.17E-05
3.38E-05
3.03E-05
3.04E-05
3.09E-05
3.24E-05
60
3.35E-05
3.16E-05
3.33E-05
3.35E-05
3.09E-05
3.31E-05
3.16E-05
3.40E-05
3.09E-05
3.09E-05
3.16E-05
3.31E-05
70
3.33E-05
3.17E-05
3.31E-05
3.38E-05
3.10E-05
3.31E-05
3.17E-05
3.40E-05
3.06E-05
3.09E-05
3.11E-05
3.31E-05
3.35E-05
8.12E-07
3.57E-05
3.12E-05
3.29E-05
1.34E-06
3.65E-05
2.92E-05
3.30E-05
6.53E-07
3.48E-05
3.13E-05
3.23E-05
1.12E-06
3.54E-05
2.92E-05
3.19E-05
9.57E-07
3.45E-05
2.93E-05
3.26E-05
1.19E-06
3.58E-05
2.93E-05
3.26E-05
1.19E-06
3.58E-05
2.93E-05
3.30E-05
3.29E-05
3.25E-05
3.19E-05
3.19E-05
3.21E-05
3.20E-05
1.59E-06
1.50E-06
1.79E-06
1.59E-06
1.59E-06
1.38E-06
1.47E-06
3.74E-05
3.70E-05
3.74E-05
3.62E-05
3.62E-05
3.59E-05
3.61E-05
2.87E-05
2.88E-05
2.76E-05
2.75E-05
2.75E-05
2.83E-05
2.80E-05
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
1.20E-04
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Adj. Pin Current Change vs. Line1 VDIFF=1.5-15V
IL=10mA (A)
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.14. Plot of Adj. Pin Current Change vs. Line1 VDIFF=1.5-15V IL=10mA (A) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.14. Raw data for Adj. Pin Current Change vs. Line1 VDIFF=1.5-15V IL=10mA (A)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Adj. Pin Current Change vs. Line1
VDIFF=1.5-15V IL=10mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.54E-07
5.08E-07
4.90E-07
3.99E-07
2.54E-07
3.63E-07
0.00E+00
2.18E-07
2.18E-07
4.17E-07
4.17E-07
3.60E-08
10
3.45E-07
5.81E-07
3.81E-07
5.08E-07
2.00E-07
2.72E-07
0.00E+00
2.18E-07
1.81E-07
3.81E-07
5.63E-07
2.90E-07
20
2.00E-07
5.45E-07
9.10E-08
3.27E-07
1.82E-07
3.99E-07
4.72E-07
1.82E-07
2.00E-07
4.90E-07
3.99E-07
2.00E-07
30
7.08E-07
2.90E-07
6.72E-07
1.09E-07
3.27E-07
0.00E+00
3.09E-07
2.54E-07
2.90E-07
3.27E-07
2.54E-07
7.08E-07
50
6.53E-07
1.45E-07
5.08E-07
1.80E-08
1.63E-07
5.08E-07
2.54E-07
2.36E-07
2.18E-07
3.45E-07
4.90E-07
4.72E-07
60
9.10E-08
4.54E-07
9.10E-08
3.63E-07
5.08E-07
9.10E-08
3.45E-07
2.90E-07
4.90E-07
3.09E-07
1.09E-07
0.00E+00
70
0.00E+00
5.44E-07
0.00E+00
4.72E-07
2.18E-07
2.00E-07
3.27E-07
2.72E-07
2.54E-07
1.09E-07
2.90E-07
4.36E-07
3.81E-07
1.23E-07
7.18E-07
4.35E-08
4.03E-07
1.48E-07
8.09E-07
-3.16E-09
2.69E-07
1.76E-07
7.51E-07
-2.13E-07
4.21E-07
2.59E-07
1.13E-06
-2.89E-07
2.97E-07
2.69E-07
1.04E-06
-4.41E-07
3.01E-07
1.99E-07
8.47E-07
-2.44E-07
2.47E-07
2.56E-07
9.48E-07
-4.55E-07
2.43E-07
2.10E-07
3.49E-07
2.36E-07
3.12E-07
3.05E-07
2.32E-07
1.62E-07
1.40E-07
1.48E-07
1.35E-07
1.20E-07
1.43E-07
8.26E-08
6.87E-07
5.94E-07
7.54E-07
6.05E-07
6.41E-07
6.97E-07
4.59E-07
-2.01E-07 -1.73E-07 -5.72E-08 -1.33E-07 -1.65E-08 -8.73E-08
6.03E-09
-5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
35
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Adj. Pin Current Change vs. Line2 VDIFF=1.5-15V
IL=500mA (A)
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.15. Plot of Adj. Pin Current Change vs. Line2 VDIFF=1.5-15V IL=500mA (A) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.15. Raw data for Adj. Pin Current Change vs. Line2 VDIFF=1.5-15V IL=500mA
(A) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Adj. Pin Current Change vs. Line2
VDIFF=1.5-15V IL=500mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
9.10E-08
3.63E-07
9.10E-08
7.26E-07
1.81E-07
0.00E+00
0.00E+00
2.72E-07
-9.10E-08
5.44E-07
3.63E-07
3.63E-07
10
1.81E-07
9.10E-08
0.00E+00
0.00E+00
0.00E+00
-3.63E-07
0.00E+00
0.00E+00
0.00E+00
3.63E-07
1.09E-06
9.10E-08
20
0.00E+00
5.45E-07
3.63E-07
0.00E+00
0.00E+00
5.45E-07
3.63E-07
3.63E-07
3.63E-07
5.45E-07
3.63E-07
1.82E-07
30
0.00E+00
0.00E+00
0.00E+00
1.82E-07
1.82E-07
0.00E+00
0.00E+00
5.45E-07
4.54E-07
7.26E-07
3.63E-07
1.09E-06
50
7.26E-07
0.00E+00
1.09E-06
0.00E+00
-1.82E-07
7.26E-07
3.63E-07
0.00E+00
7.26E-07
7.26E-07
0.00E+00
7.26E-07
60
9.10E-08
3.63E-07
1.81E-07
9.10E-08
3.63E-07
0.00E+00
2.72E-07
0.00E+00
1.81E-07
7.26E-07
1.81E-07
0.00E+00
70
0.00E+00
0.00E+00
2.72E-07
1.81E-07
2.72E-07
0.00E+00
0.00E+00
2.72E-07
1.81E-07
3.63E-07
0.00E+00
0.00E+00
2.90E-07
2.68E-07
1.02E-06
-4.43E-07
5.44E-08
8.10E-08
2.77E-07
-1.68E-07
1.82E-07
2.57E-07
8.86E-07
-5.23E-07
7.28E-08
9.97E-08
3.46E-07
-2.01E-07
3.27E-07
5.51E-07
1.84E-06
-1.18E-06
2.18E-07
1.38E-07
5.95E-07
-1.59E-07
1.45E-07
1.37E-07
5.22E-07
-2.32E-07
1.45E-07 0.00E+00
4.36E-07
3.45E-07
5.08E-07
2.36E-07
1.63E-07
2.61E-07
2.57E-07
9.97E-08
3.30E-07
3.25E-07
2.98E-07
1.62E-07
8.61E-07
7.04E-07
7.09E-07
1.25E-06
1.40E-06
1.05E-06
6.08E-07
-5.71E-07 -7.04E-07
1.62E-07 -5.59E-07 -3.82E-07 -5.82E-07 -2.82E-07
-5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Adj. Pin Current Change vs. Load1 VDIFF=1.5V IL=10mA1.5A (A)
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.16. Plot of Adj. Pin Current Change vs. Load1 VDIFF=1.5V IL=10mA-1.5A (A) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.16. Raw data for Adj. Pin Current Change vs. Load1 VDIFF=1.5V IL=10mA-1.5A
(A) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Adj. Pin Current Change vs. Load1
VDIFF=1.5V IL=10mA-1.5A (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
-9.10E-08
0.00E+00
-5.40E-08
5.81E-07
1.80E-08
9.10E-08
0.00E+00
-4.90E-07
2.36E-07
9.10E-08
5.44E-07
1.63E-07
10
5.08E-07
-3.63E-07
1.81E-07
-1.45E-07
2.18E-07
7.30E-08
3.60E-08
1.80E-08
1.27E-07
1.45E-07
1.45E-07
1.45E-07
20
-7.30E-08
-4.36E-07
-6.35E-07
2.54E-07
4.17E-07
3.45E-07
2.18E-07
9.10E-08
1.82E-07
6.53E-07
4.54E-07
1.09E-07
30
-2.90E-07
-7.30E-08
1.80E-08
7.30E-08
9.10E-08
7.30E-08
5.40E-08
-2.00E-07
-1.09E-07
-8.71E-07
-1.80E-08
-1.45E-07
50
-4.36E-07
-9.10E-08
7.30E-08
0.00E+00
-7.30E-08
7.26E-07
0.00E+00
1.82E-07
1.80E-08
1.09E-07
5.40E-08
0.00E+00
60
2.36E-07
-9.80E-07
1.45E-07
3.27E-07
1.09E-07
3.60E-08
1.80E-08
1.81E-07
5.26E-07
0.00E+00
1.45E-07
-1.81E-07
70
0.00E+00
3.60E-08
1.80E-08
-1.45E-07
-3.60E-08
9.10E-08
2.90E-07
2.18E-07
1.63E-07
-5.99E-07
-3.60E-08
0.00E+00
9.08E-08
2.77E-07
8.51E-07
-6.70E-07
7.98E-08
3.39E-07
1.01E-06
-8.49E-07
-9.46E-08
4.45E-07
1.13E-06
-1.31E-06
-3.62E-08
1.56E-07
3.90E-07
-4.63E-07
-1.05E-07
1.96E-07
4.32E-07
-6.43E-07
-3.26E-08
5.36E-07
1.44E-06
-1.50E-06
-2.54E-08
7.20E-08
1.72E-07
-2.23E-07
-1.44E-08
7.98E-08
2.98E-07 -2.11E-07
2.07E-07
1.52E-07
3.26E-08
2.79E-07
5.54E-08
2.18E-07
3.86E-07
2.99E-07
2.21E-07
3.61E-07
7.51E-07
2.32E-07
8.97E-07
8.49E-07
1.03E-06
7.58E-07
1.02E-06
-7.79E-07 -7.20E-08 -3.01E-07 -1.27E-06 -6.13E-07 -4.54E-07 -9.56E-07
-5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
39
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Adj. Pin Current Change vs. Load2 VDIFF=15V IL=10500mA (A)
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.17. Plot of Adj. Pin Current Change vs. Load2 VDIFF=15V IL=10-500mA (A) versus total dose.
The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the samples irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.17. Raw data for Adj. Pin Current Change vs. Load2 VDIFF=15V IL=10-500mA
(A) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Adj. Pin Current Change vs. Load2
VDIFF=15V IL=10-500mA (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
Total Dose (krad(Si))
24-hr
Anneal
168-hr
Anneal
0
2.72E-07
9.10E-08
1.09E-07
-6.35E-07
-1.80E-08
1.45E-07
7.30E-08
7.30E-08
0.00E+00
-3.09E-07
-5.40E-08
3.60E-08
10
-2.54E-07
3.45E-07
1.09E-07
-1.81E-07
0.00E+00
3.63E-07
-1.45E-07
-1.45E-07
-1.80E-08
-5.44E-07
-9.10E-08
1.27E-07
20
9.10E-08
7.30E-08
-5.40E-08
-3.60E-08
-9.10E-08
1.80E-08
2.54E-07
4.17E-07
-1.63E-07
9.10E-08
-3.60E-08
0.00E+00
30
7.30E-08
-1.45E-07
-3.27E-07
1.80E-08
-4.36E-07
0.00E+00
-7.30E-08
-2.72E-07
-3.63E-07
1.80E-08
-4.54E-07
2.18E-07
50
-1.82E-07
-7.30E-08
-4.72E-07
0.00E+00
7.30E-08
2.90E-07
-4.72E-07
0.00E+00
1.09E-07
-5.40E-08
1.82E-07
3.09E-07
60
-3.45E-07
1.45E-07
1.80E-08
-3.60E-08
7.30E-08
0.00E+00
5.40E-08
1.80E-08
-1.27E-07
3.27E-07
-1.27E-07
0.00E+00
70
-1.09E-07
3.60E-08
0.00E+00
1.80E-08
2.36E-07
0.00E+00
1.09E-07
1.63E-07
-3.60E-08
3.60E-08
-1.09E-07
0.00E+00
-3.62E-08
3.50E-07
9.25E-07
-9.97E-07
3.80E-09
2.39E-07
6.59E-07
-6.51E-07
-3.40E-09
8.07E-08
2.18E-07
-2.25E-07
-1.63E-07
2.18E-07
4.35E-07
-7.61E-07
-1.31E-07
2.13E-07
4.53E-07
-7.14E-07
-2.90E-08
1.89E-07
4.89E-07
-5.47E-07
3.62E-08
1.25E-07
3.79E-07
-3.07E-07
-3.60E-09 -9.78E-08
1.23E-07 -1.38E-07 -2.54E-08
5.44E-08
5.44E-08
1.78E-07
3.25E-07
2.22E-07
1.70E-07
2.82E-07
1.67E-07
8.10E-08
4.85E-07
7.93E-07
7.33E-07
3.29E-07
7.48E-07
5.12E-07
2.77E-07
-4.92E-07 -9.89E-07 -4.86E-07 -6.05E-07 -7.99E-07 -4.03E-07 -1.68E-07
-5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06 -5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
5.00E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
41
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Minimum Load Current VDIFF=25V (A)
1.20E-02
1.00E-02
8.00E-03
6.00E-03
4.00E-03
2.00E-03
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.18. Plot of Minimum Load Current VDIFF=25V (A) versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.18. Raw data for Minimum Load Current VDIFF=25V (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Minimum Load Current VDIFF=25V (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24-hr
Anneal
168-hr
Anneal
0
2.76E-03
2.73E-03
2.74E-03
2.78E-03
2.72E-03
2.73E-03
2.71E-03
2.78E-03
2.72E-03
2.66E-03
2.71E-03
2.75E-03
10
2.76E-03
2.73E-03
2.73E-03
2.74E-03
2.72E-03
2.72E-03
2.70E-03
2.76E-03
2.71E-03
2.66E-03
2.67E-03
2.75E-03
20
2.73E-03
2.70E-03
2.74E-03
2.75E-03
2.73E-03
2.73E-03
2.71E-03
2.77E-03
2.72E-03
2.66E-03
2.71E-03
2.75E-03
30
2.72E-03
2.69E-03
2.73E-03
2.75E-03
2.69E-03
2.73E-03
2.70E-03
2.77E-03
2.71E-03
2.66E-03
2.67E-03
2.74E-03
50
2.77E-03
2.69E-03
2.77E-03
2.79E-03
2.68E-03
2.76E-03
2.70E-03
2.81E-03
2.67E-03
2.69E-03
2.66E-03
2.73E-03
60
2.78E-03
2.75E-03
2.79E-03
2.80E-03
2.70E-03
2.78E-03
2.71E-03
2.82E-03
2.68E-03
2.71E-03
2.72E-03
2.75E-03
70
2.78E-03
2.70E-03
2.78E-03
2.80E-03
2.69E-03
2.73E-03
2.71E-03
2.82E-03
2.72E-03
2.66E-03
2.67E-03
2.74E-03
2.75E-03
2.43E-05
2.81E-03
2.68E-03
2.73E-03
1.65E-05
2.78E-03
2.69E-03
2.73E-03
1.87E-05
2.78E-03
2.68E-03
2.72E-03
2.51E-05
2.79E-03
2.65E-03
2.74E-03
4.92E-05
2.87E-03
2.60E-03
2.76E-03
3.97E-05
2.87E-03
2.65E-03
2.75E-03
5.02E-05
2.89E-03
2.61E-03
2.72E-03
2.71E-03
2.72E-03
2.71E-03
2.73E-03
2.74E-03
2.73E-03
4.17E-05
3.88E-05
4.02E-05
3.99E-05
5.76E-05
5.55E-05
5.79E-05
2.83E-03
2.82E-03
2.83E-03
2.82E-03
2.89E-03
2.89E-03
2.89E-03
2.61E-03
2.60E-03
2.61E-03
2.61E-03
2.57E-03
2.59E-03
2.57E-03
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
1.00E-02
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
43
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
2.40E+00
Current Limit1 VDIFF=5V (A)
2.20E+00
2.00E+00
1.80E+00
1.60E+00
1.40E+00
1.20E+00
1.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Figure 5.19. Plot of Current Limit1 VDIFF=5V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
10-006 100412 R1.3
Table 5.19. Raw data for Current Limit1 VDIFF=5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Current Limit1 VDIFF=5V (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
2.09E+00
2.05E+00
2.01E+00
2.09E+00
2.25E+00
2.05E+00
2.27E+00
2.15E+00
2.05E+00
2.01E+00
2.25E+00
2.05E+00
10
2.11E+00
2.09E+00
2.03E+00
2.13E+00
2.27E+00
2.09E+00
2.29E+00
2.21E+00
2.07E+00
2.05E+00
2.25E+00
2.05E+00
20
2.13E+00
2.09E+00
2.05E+00
2.15E+00
2.29E+00
2.11E+00
2.30E+00
2.25E+00
2.09E+00
2.07E+00
2.25E+00
2.05E+00
30
2.15E+00
2.11E+00
2.05E+00
2.15E+00
2.30E+00
2.13E+00
2.34E+00
2.27E+00
2.13E+00
2.09E+00
2.25E+00
2.05E+00
50
2.21E+00
2.17E+00
2.11E+00
2.21E+00
2.36E+00
2.17E+00
2.38E+00
2.32E+00
2.17E+00
2.15E+00
2.25E+00
2.05E+00
24-hr
Anneal
168-hr
Anneal
60
2.19E+00
2.15E+00
2.09E+00
2.19E+00
2.34E+00
2.17E+00
2.36E+00
2.32E+00
2.15E+00
2.13E+00
2.25E+00
2.05E+00
70
2.15E+00
2.13E+00
2.07E+00
2.17E+00
2.32E+00
2.13E+00
2.32E+00
2.25E+00
2.11E+00
2.09E+00
2.25E+00
2.05E+00
Biased Statistics
Average Biased
2.10E+00 2.13E+00 2.14E+00 2.15E+00 2.21E+00 2.19E+00 2.17E+00
Std Dev Biased
9.12E-02
8.88E-02
9.12E-02
9.23E-02
9.23E-02
9.23E-02
9.28E-02
Ps90%/90% (+KTL) Biased
2.35E+00 2.37E+00 2.39E+00 2.41E+00 2.47E+00 2.45E+00 2.42E+00
Ps90%/90% (-KTL) Biased
1.85E+00 1.88E+00 1.89E+00 1.90E+00 1.96E+00 1.94E+00 1.91E+00
Un-Biased Statistics
Average Un-Biased
2.11E+00 2.14E+00 2.16E+00 2.19E+00 2.24E+00 2.23E+00 2.18E+00
Std Dev Un-Biased
1.05E-01
1.04E-01
1.04E-01
1.07E-01
1.05E-01
1.06E-01
1.00E-01
Ps90%/90% (+KTL) Un-Biased
2.39E+00 2.43E+00 2.45E+00 2.49E+00 2.53E+00 2.52E+00 2.45E+00
Ps90%/90% (-KTL) Un-Biased
1.82E+00 1.86E+00 1.88E+00 1.90E+00 1.95E+00 1.94E+00 1.91E+00
Specification MIN
1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.60E-01
Current Limit2 VDIFF=25V (A)
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.20. Plot of Current Limit2 VDIFF=25V (A) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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Table 5.20. Raw data for Current Limit2 VDIFF=25V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Current Limit2 VDIFF=25V (A)
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
10
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
20
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
30
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
50
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
24-hr
Anneal
168-hr
Anneal
60
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
70
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Biased Statistics
Average Biased
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Std Dev Biased
0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00
Ps90%/90% (+KTL) Biased
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Ps90%/90% (-KTL) Biased
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Un-Biased Statistics
Average Un-Biased
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Std Dev Un-Biased
0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00
Ps90%/90% (+KTL) Un-Biased
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Ps90%/90% (-KTL) Un-Biased
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
1.40E-01
Specification MIN
5.00E-02
5.00E-02
4.90E-02
4.90E-02
4.80E-02
4.80E-02
4.80E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E+00
Dropout Voltage IL=1.5A (V)
1.50E+00
1.40E+00
1.30E+00
1.20E+00
1.10E+00
1.00E+00
0
10
20
30
40
50
24-Hr
60
Anneal
168-Hr
70
Anneal
Total Dose (krad(Si))
Figure 5.21. Plot of Dropout Voltage IL=1.5A (V) versus total dose. The solid diamonds are the average of
the measured data points for the samples irradiated under electrical bias while the shaded diamonds are the
average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
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Table 5.21. Raw data for Dropout Voltage IL=1.5A (V) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Dropout Voltage IL=1.5A (V)
Device
4
8
11
14
17
19
41
60
62
65
149
153
0
1.22E+00
1.22E+00
1.26E+00
1.22E+00
1.26E+00
1.22E+00
1.22E+00
1.21E+00
1.22E+00
1.22E+00
1.27E+00
1.21E+00
10
1.21E+00
1.22E+00
1.22E+00
1.22E+00
1.23E+00
1.25E+00
1.22E+00
1.23E+00
1.23E+00
1.23E+00
1.27E+00
1.21E+00
20
1.28E+00
1.23E+00
1.25E+00
1.27E+00
1.25E+00
1.24E+00
1.23E+00
1.22E+00
1.23E+00
1.23E+00
1.31E+00
1.21E+00
30
1.24E+00
1.24E+00
1.25E+00
1.23E+00
1.24E+00
1.23E+00
1.23E+00
1.23E+00
1.23E+00
1.23E+00
1.27E+00
1.21E+00
50
1.24E+00
1.23E+00
1.25E+00
1.23E+00
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.22E+00
1.21E+00
24-hr
Anneal
168-hr
Anneal
60
1.23E+00
1.23E+00
1.23E+00
1.22E+00
1.24E+00
1.23E+00
1.23E+00
1.23E+00
1.24E+00
1.24E+00
1.24E+00
1.20E+00
70
1.24E+00
1.28E+00
1.25E+00
1.22E+00
1.23E+00
1.30E+00
1.23E+00
1.36E+00
1.28E+00
1.23E+00
1.24E+00
1.21E+00
Biased Statistics
Average Biased
1.24E+00 1.22E+00 1.25E+00 1.24E+00 1.24E+00 1.23E+00 1.24E+00
Std Dev Biased
2.24E-02
8.22E-03
1.94E-02
7.68E-03
7.42E-03
6.77E-03
2.37E-02
Ps90%/90% (+KTL) Biased
1.30E+00 1.24E+00 1.31E+00 1.26E+00 1.26E+00 1.25E+00 1.31E+00
Ps90%/90% (-KTL) Biased
1.18E+00 1.20E+00 1.20E+00 1.22E+00 1.22E+00 1.21E+00 1.18E+00
Un-Biased Statistics
Average Un-Biased
1.22E+00 1.23E+00 1.23E+00 1.23E+00 1.24E+00 1.23E+00 1.28E+00
Std Dev Un-Biased
6.02E-03
1.09E-02
8.56E-03
2.66E-03
2.91E-03
6.17E-03
5.19E-02
Ps90%/90% (+KTL) Un-Biased
1.23E+00 1.26E+00 1.25E+00 1.24E+00 1.25E+00 1.25E+00 1.42E+00
Ps90%/90% (-KTL) Un-Biased
1.20E+00 1.20E+00 1.21E+00 1.22E+00 1.23E+00 1.22E+00 1.14E+00
Specification MAX
1.500
1.500
1.510
1.510
1.520
1.520
1.520
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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6.0. Summary / Conclusions
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source.
Samples of the RH1086MK Low Dropout Positive Adjustable Regulator described in this report were
irradiated biased with a single-ended 30V supply and unbiased (all leads tied to ground). The devices
were irradiated to a maximum total ionizing dose level of 50krad(Si) with a pre-irradiation baseline
reading as well as incremental readings at 10, 20, and 30krad(Si). Electrical testing occurred within one
hour following the end of each irradiation segment. For intermediate irradiations, the units were tested
and returned to total dose exposure within two hours from the end of the previous radiation increment.
In addition, all units-under-test received a 24hr room temperature and 168hr 100°C anneal, using the
same bias conditions as the radiation exposure.
The parametric data was obtained as read and record and all the raw data plus an attributes summary are
contained in a separate Excel file. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used in this work is 2.742 per MIL-HDBK-814
using one sided tolerance limits of 90/90 and a 5-piece sample size. The 90/90 KTL values were
selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the
qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be
met for a device to pass the low dose rate test: following the radiation exposure each of the 5 pieces
irradiated under electrical bias shall pass the specification value. The units irradiated without electrical
bias and the KTL statistics are included in this report for reference only. If any of the 5 pieces irradiated
under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure.
Using the conditions stated above, the RH1086MK Low Dropout Positive Adjustable Regulator (from
the lot date code identified on the first page of this test report) passed the low dose rate test with only
minor degradation to the VOUT parameters.
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Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Markings
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Appendix B: TID Bias Connections
(Extracted from LINEAR TECHNOLOGY CORPORATION RH1086M Datasheet)
Biased Samples:
Pin
1
2
Function
Bias
ADJ
GND
VIN
+30V decoupled with 10μF Tantalum Capacitor
GND via 150Ω Resistor in Parallel
3 (CASE) VOUT
with a 10μF Tantalum Capacitor
Unbiased Samples (All Pins Tied to Ground):
Pin
Function Bias
1
ADJ
GND
2
VIN
GND
3 (CASE) VOUT GND
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30V
GND
Figure B.1. Irradiation bias circuit for the units to be irradiated under electrical bias. Both the input and output must
be decoupled with 10μF of tantalum capacitance (see bias table above). Note that this figure is intentionally different
from the bias circuit defined in the LINEAR TECHNOLOGY CORPORATION RH1086M Datasheet and was
approved by the customer.
Figure B.2. K package drawing (for reference only). This figure was extracted from the LINEAR TECHNOLOGY
CORPORATION RH1086M Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0606 Regulator Fixture and the RH1086K BGSS-020602 DUT board. The measured parameters and
test conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained either from test data or from the DAC resolution of the LTS2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested
repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and
standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the
measured standard deviation to generate the final measurement range. This value encompasses the
precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board,
socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is
limited by the internal DACs, which results in a measured standard deviation of zero. In these instances
the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to relatively large variations within the sample population compared to the
specification value. If necessary, larger samples sizes could be used to qualify these parameters using an
“attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH1086MK. Unless otherwise
noted the conditions were selected to match the post-irradiation specifications. See LINEAR
TECHNOLOGY CORPORATION RH1086M Datasheet for the post irradiation test conditions
and specifications.
Test Description
Reference Voltage 1 (V)
Test Conditions
VDIFF = VIN-VOUT
VDIFF=3V IL=10mA
Reference Voltage 2 (V)
VDIFF=1.5V IL=10mA
Reference Voltage 3 (V)
VDIFF=1.5V IL=1.5A
Reference Voltage 4 (V)
VDIFF=15V IL=10mA
Reference Voltage 5 (V)
VDIFF=15V IL=500mA
Line Regulation (%)
VDIFF=1.5 to 15V IL=10mA
Load Regulation (%)
VDIFF=3V IL=10mA to 1.5A
Adj. Pin Current 1 (A)
VDIFF=1.5V IL=10mA
Adj. Pin Current 2 (A)
VDIFF=3V IL=10mA
Adj. Pin Current 3 (A)
VDIFF=15V IL=10mA
Adj. Pin Current 4 (A)
VDIFF=1.5V IL=1.5A
Adj. Pin Current 5 (A)
VDIFF=3V IL=1.5A
Adj. Pin Current 6 (A)
VDIFF=15V IL=500mA
Adj. Pin Current Change vs. Line 1 (A)
VDIFF=1.5 to 15V IL=10mA
Adj. Pin Current Change vs. Line 2 (A)
VDIFF=1.5 to 15V IL=500mA
Adj. Pin Current Change vs. Load 1 (A) VDIFF=1.5V IL=10mA to 1.5A
Adj. Pin Current Change vs. Load 2 (A) VDIFF=15V IL=10 to 500mA
Minimum Load Current (A)
(VIN-VOUT)= 25V
Current Limit 1 (A)
VDIFF=5V (A)
Current Limit 2 (A)
VDIFF=25V (A)
Dropout Voltage (V)
IL=1.5A
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Table C.2. Measured parameters, pre-irradiation specifications and measurement resolution
for the RH1086MK.
Measured Parameter
Reference Voltage (V)
Pre-Irradiation
Measurement
Specification
Precision/Resolution
1.238-1.262V
±1.00E-03V
1.225-1.270V
Line Regulation (%)
±0.2% MAX
±2.12E-02%
Load Regulation (%)
±0.3% MAX
±4.25E-02A
Adj. Pin Current (A)
120µA MAX
±6.45E-07A
Adj. Pin Current Change (A)
±5µA MAX
±4.98E-07A
Minimum Load Current (A)
10mA MAX
±5.51E-06A
Current Limit (A)
1.5A MIN
50mA MIN
±1E-03A
Dropout Voltage (V)
1.5V MAX
±5.94E-03V
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Appendix D: List of Figures used in Section 5 (Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
Output Voltage (V) @ Vdiff=3V, Il=10mA
Output Voltage (V) @ Vdiff=1.5V, Il=10mA
Output Voltage (V) @ Vdiff=3V, Il=1.5A
Output Voltage (V) @ Vdiff=15V, Il=10mA
Output Voltage (V) @ Vdiff=15V, Il=0.5A
Line Regulation (%); Vdiff=1.5V to 15V, Il=10mA
Load Regulation (%); Vdiff=3V, Il=10mA to 1.5A
Adjust pin Current (A); Vdiff=1.5V, Il=10mA
Adjust pin Current (A); Vdiff=3V, Il=10mA
Adjust pin Current (A); Vdiff=15V, Il=10mA
Adjust pin Current (A); Vdiff=1.5V, Il=1.5A
Adjust pin Current (A); Vdiff=3V, Il=1.5A
Adjust pin Current (A); Vdiff=15V, Il=0.5A
Adjust Pin Current Change (A); Vdiff=1.5V to 15V, Il=10mA
Adjust Pin Current Change (A); Vdiff=1.5V to 15V, Il=0.5A
Adjust Pin Current Change (A); Vdiff=1.5V, Il=10mA to 1.5A
Adjust Pin Current Change (A); Vdiff=1.5V, Il=10mA to 0.5A
Minimum Load Current (A); Vdiff=25V
Current Limit (A); Vdiff=5V
Current Limit (A); Vdiff=25V
Dropout Voltage (V) @ Il=1.5A
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