ELDRS Report_RH1499MW_Fab Lot W10737593.1.pdf

ELDRS Report
08-133 090622 R1.2
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH1499MW Quad Precision Op Amp for Linear Technology
Customer: Linear Technology (PO# 49797L)
RAD Job Number: 08-133
Part Type Tested: Linear Technology RH1499MW Quad Precision Op Amp
Commercial Part Number: RH1499MW
Traceability Information: Lot Date Code: 0731A, FAB W10737593.1, Wafer 19, LOT 447411.1 (Obtained
from Linear Technology PO 49797L). See photograph of unit under test in Appendix A.
Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit.
Serial numbers 866-870 were biased during irradiation, serial numbers 871-874 and 876 were unbiased during
irradiation and serial number 877 was used as the control. See Appendix B for the radiation bias connection table.
External Traveler: None Required
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD.
TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si).
TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations.
Electrical measurements shall be made following each anneal increment.
TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D
TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure.
Test Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1499 BGSS-061114 DUT Board
Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using
the GB-150 low dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s
dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM
1019.5
Irradiation and Test Temperature: All irradiations and electrical tests performed at room temperature
controlled to 24°C ± 6°C per MIL STD 883.
ELDRS Test Result: PASSED to 30krad(Si) but FAILED at 50krad(Si) due to
degradation of the output voltage swing and short circuit current for the singlesided 3V supply condition and the power supply rejection ratio at the singlesided 2.2V to 12V supply range
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1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could
potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The ELDRS testing described in this final report was performed using the facilities at Radiation Assured
Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance
from the source. For the low dose rate ELDRS testing described in this report, the devices are placed
approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation
Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the
National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60
irradiator at RAD’s Longmire Laboratory facility.
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Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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3.0.
Radiation Assured Devices
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Radiation Test Conditions
The RH1499MW Quad operational amplifier described in this final report was irradiated using two bias
conditions, statically biased with a split 15V supply and all pins tied to ground, see Appendix A for
details on biasing conditions during the radiation exposure. These devices were irradiated to a
maximum total ionizing dose level of 50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si).
Electrical testing occurred within one hour following the end of each irradiation segment. For
intermediate irradiations, the units were tested and returned to total dose exposure within two hours from
the end of the previous radiation increment. The ELDRS bias board was positioned in the Co-60 cell to
provide the required 10mrad(Si)/s and was located inside a lead-aluminum box. The lead-aluminum box
is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum
(Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement
effects caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner
shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle
equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the
Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration
of the source, container, or test-fixture is changed. This measurement shall be performed by placing a
dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it
can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry
errors due to dose enhancement, the Pb/Al container may be omitted”.
The final dose rate within the lead-aluminum box was determined based on TLD dosimetry
measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work
was 10.0mrad(Si)/s with a precision of ±5%.
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4.0.
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Tested Parameters
During the radiation lot acceptance testing the following pre- and post-irradiation electrical parameters
were measured (note that the full set of test conditions for the parameters listed below are shown in
Appendix B):
Measured parameters and test conditions for VS=±15V:
1. Positive Supply Current
2. Negative Supply Current
3. Input Offset Voltage (Op Amp 1-4)
4. Input Offset Current (Op Amp 1-4)
5. + Input Bias Current (Op Amp 1-4)
6. - Input Bias Current (Op Amp 1-4)
7. Input Offset Voltage (Op Amp 1-4)
8. Input Offset Current (Op Amp 1-4)
9. + Input Bias Current (Op Amp 1-4)
10. - Input Bias Current (Op Amp 1-4)
11. Input Offset Voltage (Op Amp 1-4)
12. Input Offset Current (Op Amp 1-4)
13. + Input Bias Current (Op Amp 1-4)
14. - Input Bias Current (Op Amp 1-4)
15. Large Signal Voltage Gain (Op Amp 1-4)
16. Large Signal Voltage Gain (Op Amp 1-4)
17. CMRR (Op Amp 1-4)
18. CMRR Matching 1-4
19. CMRR Matching 2-3
20. PSRR (Op Amp 1-4)
21. PSRR Matching 1-4
22. PSRR Matching 2-3
23. Output Voltage Swing High (Op Amp 1-4)
24. Output Voltage Swing High (Op Amp 1-4)
25. Output Voltage Swing High (Op Amp 1-4)
26. Output Voltage Swing Low (Op Amp 1-4)
27. Output Voltage Swing Low (Op Amp 1-4)
28. Output Voltage Swing Low (Op Amp 1-4)
29. +VS Short-Circuit Current (Op Amp 1-4)
30. -VS Short-Circuit Current (Op Amp 1-4)
Measured parameters and test conditions for VS=3V:
31. Positive Supply Current
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32. Negative Supply Current
33. Input Offset Voltage (Op Amp 1-4)
34. Input Offset Current (Op Amp 1-4)
35. + Input Bias Current (Op Amp 1-4)
36. - Input Bias Current (Op Amp 1-4)
37. Input Offset Voltage (Op Amp 1-4)
38. Input Offset Current (Op Amp 1-4)
39. + Input Bias Current (Op Amp 1-4)
40. - Input Bias Current (Op Amp 1-4)
41. Large Signal Voltage Gain (Op Amp 1-4)
42. CMRR (Op Amp 1-4)
43. CMRR Matching 1-4
44. CMRR Matching 2-3
45. Output Voltage Swing High (Op Amp 1-4)
46. Output Voltage Swing High (Op Amp 1-4)
47. Output Voltage Swing High (Op Amp 1-4)
48. Output Voltage Swing Low (Op Amp 1-4)
49. Output Voltage Swing Low (Op Amp 1-4)
50. Output Voltage Swing Low (Op Amp 1-4)
51. +VS Short-Circuit Current (Op Amp 1-4)
52. -VS Short-Circuit Current (Op Amp 1-4)
Measured parameters and test conditions for VS=5V:
53. Positive Supply Current
54. Negative Supply Current
55. Input Offset Voltage (Op Amp 1-4)
56. Input Offset Voltage (Op Amp 1-4)
57. Input Offset Current (Op Amp 1-4)
58. Input Offset Current (Op Amp 1-4)
59. + Input Bias Current (Op Amp 1-4)
60. + Input Bias Current (Op Amp 1-4)
61. - Input Bias Current (Op Amp 1-4)
62. - Input Bias Current (Op Amp 1-4)
63. Large Signal Voltage Gain (Op Amp 1-4)
64. CMRR (Op Amp 1-4)
65. CMRR Matching 1-4
66. CMRR Matching 2-3
67. PSRR (Op Amp 1-4)
68. PSRR Matching 1-4
69. PSRR Matching 2-3
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Radiation Assured Devices
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70. Output Voltage Swing High (Op Amp 1-4)
71. Output Voltage Swing High (Op Amp 1-4)
72. Output Voltage Swing High (Op Amp 1-4)
73. Output Voltage Swing Low (Op Amp 1-4)
74. Output Voltage Swing Low (Op Amp 1-4)
75. Output Voltage Swing Low (Op Amp 1-4)
76. +VS Short Circuit Current (Op Amp 1-4)
77. -VS Short Circuit Current (Op Amp 1-4)
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per
MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival
probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using
a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a
device to pass the ELDRS testing: following the radiation exposure the unit shall pass the specification
value and the average value for the each device must pass the specification value when the KTL limits
are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot
could be logged as an RLAT failure.
Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
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Radiation Assured Devices
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does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled “Radiation
Lot Acceptance Test (RLAT) of the RH1499MW Quad Operational Amplifier for Linear Technology”
to demonstrate that these parts do not exhibit ELDRS as defined in the current test method.
5.0. ELDRS Test Results
Using the conditions stated above, the RH1499MW devices passed the ELDRS test to 30krad(Si) but
failed at 50krad(Si) due to degradation of the output voltage swing and short circuit current for the
single-sided 3V supply condition and power supply rejection ratio at the single-sided 2.2V to 12V
supply range. Most measured parameters showed no significant degradation with radiation and all
parameters passed to 50krad(Si) when tested using the 15V split supply condition.
Figures 5.1 through 5.268 show plots of all the measured parameters versus total ionizing dose. In the
data plots the solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated in the biased condition while the
shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on
the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
Tables 5.1 through 5.268 show the raw data, averages, standard deviation, +KTL statistics, -KTL
statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of
all the figures in this results section to facilitate the location of a particular parameter.
As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the
specification even after application of the KTL statistics (with certain exceptions, as noted below). The
control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained under control during the course of the testing.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited
to this approach due to inherent large variations. The parameters measured in this report where the preirradiation KTL values are out of specification include Common Mode Rejection Ratio, Power Supply
Rejection Ratio and Open Loop Gain, where the device exhibits extreme sensitivity to input conditions,
resulting in a very large standard deviation and a statistical error often greater than the measured value.
If necessary, larger samples sizes could be used to qualify these parameters using an “attributes”
approach.
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ELDRS Report
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Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.10E-02
Positive Supply Current (A)
1.00E-02
9.00E-03
8.00E-03
7.00E-03
6.00E-03
5.00E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.1. Plot of Positive Supply Current (A) versus total dose. The data show no significant change with
radiation. The solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.1. Raw data for Positive Supply Current (A) versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.46E-03
7.29E-03
7.41E-03
7.09E-03
7.24E-03
7.29E-03
7.38E-03
7.58E-03
7.22E-03
7.37E-03
7.29E-03
10
7.20E-03
7.26E-03
7.35E-03
6.99E-03
7.18E-03
7.23E-03
7.32E-03
7.52E-03
7.15E-03
7.30E-03
7.25E-03
20
7.15E-03
7.22E-03
7.32E-03
6.95E-03
7.14E-03
7.22E-03
7.30E-03
7.51E-03
7.12E-03
7.29E-03
7.24E-03
30
7.15E-03
7.22E-03
7.32E-03
6.94E-03
7.13E-03
7.20E-03
7.29E-03
7.49E-03
7.11E-03
7.28E-03
7.25E-03
50
7.05E-03
7.15E-03
7.26E-03
6.86E-03
7.06E-03
7.17E-03
7.25E-03
7.47E-03
7.08E-03
7.25E-03
7.26E-03
60
7.16E-03
7.24E-03
7.33E-03
6.96E-03
7.14E-03
7.19E-03
7.28E-03
7.50E-03
7.10E-03
7.27E-03
7.23E-03
70
7.16E-03
7.24E-03
7.33E-03
6.96E-03
7.14E-03
7.19E-03
7.28E-03
7.50E-03
7.10E-03
7.27E-03
7.23E-03
7.30E-03
1.46E-04
7.70E-03
6.90E-03
7.20E-03
1.33E-04
7.56E-03
6.83E-03
7.16E-03
1.36E-04
7.53E-03
6.78E-03
7.15E-03
1.40E-04
7.54E-03
6.77E-03
7.08E-03
1.47E-04
7.48E-03
6.67E-03
7.17E-03
1.37E-04
7.54E-03
6.79E-03
7.17E-03
1.37E-04
7.54E-03
6.79E-03
7.37E-03
1.35E-04
7.74E-03
7.00E-03
1.00E-02
PASS
7.30E-03
1.38E-04
7.68E-03
6.93E-03
1.00E-02
PASS
7.29E-03
1.43E-04
7.68E-03
6.89E-03
1.00E-02
PASS
7.27E-03
1.41E-04
7.66E-03
6.89E-03
1.00E-02
PASS
7.24E-03
1.44E-04
7.64E-03
6.85E-03
1.00E-02
PASS
7.27E-03
1.49E-04
7.68E-03
6.86E-03
1.00E-02
PASS
7.27E-03
1.49E-04
7.68E-03
6.86E-03
1.00E-02
PASS
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Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
-5.00E-03
Negative Supply Current (A)
-6.00E-03
-7.00E-03
-8.00E-03
-9.00E-03
-1.00E-02
-1.10E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.2. Plot of Negative Supply Current (A) versus total dose. The data show no significant change with
radiation. The solid diamonds are the average of the measured data points for the sample irradiated under
electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated
with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
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Table 5.2. Raw data for Negative Supply Current (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
-7.47E-03
-7.31E-03
-7.42E-03
-7.11E-03
-7.26E-03
-7.31E-03
-7.40E-03
-7.59E-03
-7.23E-03
-7.38E-03
-7.31E-03
10
-7.22E-03
-7.28E-03
-7.37E-03
-7.00E-03
-7.20E-03
-7.25E-03
-7.34E-03
-7.55E-03
-7.16E-03
-7.32E-03
-7.26E-03
20
-7.17E-03
-7.24E-03
-7.33E-03
-6.97E-03
-7.16E-03
-7.24E-03
-7.31E-03
-7.53E-03
-7.14E-03
-7.30E-03
-7.26E-03
30
-7.17E-03
-7.24E-03
-7.34E-03
-6.95E-03
-7.15E-03
-7.22E-03
-7.30E-03
-7.51E-03
-7.13E-03
-7.29E-03
-7.28E-03
50
-7.07E-03
-7.17E-03
-7.27E-03
-6.87E-03
-7.07E-03
-7.19E-03
-7.28E-03
-7.49E-03
-7.10E-03
-7.26E-03
-7.28E-03
60
-7.17E-03
-7.25E-03
-7.34E-03
-6.97E-03
-7.16E-03
-7.21E-03
-7.30E-03
-7.52E-03
-7.12E-03
-7.29E-03
-7.25E-03
70
-7.17E-03
-7.25E-03
-7.34E-03
-6.97E-03
-7.16E-03
-7.21E-03
-7.30E-03
-7.52E-03
-7.12E-03
-7.29E-03
-7.25E-03
-7.31E-03
1.42E-04
-6.93E-03
-7.70E-03
-7.21E-03
1.37E-04
-6.84E-03
-7.59E-03
-7.17E-03
1.33E-04
-6.81E-03
-7.54E-03
-7.17E-03
1.44E-04
-6.78E-03
-7.56E-03
-7.09E-03
1.48E-04
-6.68E-03
-7.50E-03
-7.18E-03
1.37E-04
-6.80E-03
-7.55E-03
-7.18E-03
1.37E-04
-6.80E-03
-7.55E-03
-7.38E-03
1.34E-04
-7.01E-03
-7.75E-03
-1.00E-02
PASS
-7.32E-03
1.45E-04
-6.93E-03
-7.72E-03
-1.00E-02
PASS
-7.30E-03
1.43E-04
-6.91E-03
-7.70E-03
-1.00E-02
PASS
-7.29E-03
1.41E-04
-6.90E-03
-7.68E-03
-1.00E-02
PASS
-7.26E-03
1.45E-04
-6.87E-03
-7.66E-03
-1.00E-02
PASS
-7.29E-03
1.49E-04
-6.88E-03
-7.70E-03
-1.00E-02
PASS
-7.29E-03
1.49E-04
-6.88E-03
-7.70E-03
-1.00E-02
PASS
An ISO 9001:2000 Certified Company
12
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.3. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
13
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.3. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.92E-04
-5.71E-05
-3.37E-04
6.50E-05
-1.86E-04
-1.77E-04
-2.69E-04
-9.02E-06
-1.55E-04
-7.59E-05
-3.73E-04
10
-2.02E-04
-7.85E-05
-3.57E-04
5.09E-05
-2.08E-04
-1.88E-04
-2.77E-04
-2.78E-05
-1.65E-04
-8.77E-05
-3.74E-04
20
-1.87E-04
-8.44E-05
-3.54E-04
6.25E-05
-2.03E-04
-1.86E-04
-2.81E-04
-2.74E-05
-1.65E-04
-8.61E-05
-3.75E-04
30
-1.79E-04
-8.89E-05
-3.54E-04
6.41E-05
-1.95E-04
-1.91E-04
-2.81E-04
-3.19E-05
-1.65E-04
-8.32E-05
-3.75E-04
50
-1.78E-04
-9.41E-05
-3.60E-04
6.73E-05
-1.91E-04
-1.89E-04
-2.79E-04
-2.90E-05
-1.68E-04
-8.25E-05
-3.75E-04
60
-1.76E-04
-9.22E-05
-3.61E-04
7.73E-05
-1.90E-04
-1.87E-04
-2.78E-04
-2.70E-05
-1.68E-04
-8.16E-05
-3.76E-04
70
-1.76E-04
-9.22E-05
-3.61E-04
7.73E-05
-1.90E-04
-1.87E-04
-2.78E-04
-2.70E-05
-1.68E-04
-8.16E-05
-3.76E-04
-1.41E-04
1.52E-04
2.76E-04
-5.59E-04
-1.59E-04
1.53E-04
2.61E-04
-5.79E-04
-1.53E-04
1.54E-04
2.70E-04
-5.76E-04
-1.51E-04
1.53E-04
2.70E-04
-5.71E-04
-1.51E-04
1.55E-04
2.75E-04
-5.77E-04
-1.48E-04
1.59E-04
2.89E-04
-5.86E-04
-1.48E-04
1.59E-04
2.89E-04
-5.86E-04
-1.37E-04
9.94E-05
1.35E-04
-4.10E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.49E-04
9.56E-05
1.13E-04
-4.11E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.49E-04
9.70E-05
1.17E-04
-4.15E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.50E-04
9.68E-05
1.15E-04
-4.16E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.49E-04
9.71E-05
1.17E-04
-4.16E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.48E-04
9.74E-05
1.19E-04
-4.15E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.48E-04
9.74E-05
1.19E-04
-4.15E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
14
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.4. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
15
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.4. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.11E-04
-2.28E-05
1.25E-04
-1.11E-04
4.59E-05
-2.39E-04
1.06E-05
-2.06E-04
-3.42E-04
-1.88E-04
-3.55E-04
10
1.70E-04
-4.27E-05
1.13E-04
-1.27E-04
1.74E-05
-2.53E-04
4.87E-06
-2.16E-04
-3.41E-04
-2.01E-04
-3.59E-04
20
1.85E-04
-3.46E-05
1.18E-04
-1.14E-04
1.73E-05
-2.53E-04
5.11E-06
-2.13E-04
-3.40E-04
-2.02E-04
-3.59E-04
30
1.87E-04
-3.02E-05
1.22E-04
-1.10E-04
2.43E-05
-2.54E-04
6.07E-06
-2.13E-04
-3.41E-04
-2.03E-04
-3.59E-04
50
1.83E-04
-3.05E-05
1.23E-04
-1.09E-04
1.56E-05
-2.58E-04
6.44E-06
-2.16E-04
-3.48E-04
-2.04E-04
-3.62E-04
60
1.94E-04
-2.75E-05
1.28E-04
-9.61E-05
2.76E-05
-2.54E-04
7.40E-06
-2.15E-04
-3.45E-04
-2.03E-04
-3.63E-04
70
1.94E-04
-2.75E-05
1.28E-04
-9.61E-05
2.76E-05
-2.54E-04
7.40E-06
-2.15E-04
-3.45E-04
-2.03E-04
-3.63E-04
4.98E-05
1.25E-04
3.93E-04
-2.94E-04
2.61E-05
1.19E-04
3.52E-04
-3.00E-04
3.44E-05
1.19E-04
3.62E-04
-2.93E-04
3.87E-05
1.18E-04
3.63E-04
-2.85E-04
3.65E-05
1.17E-04
3.58E-04
-2.85E-04
4.51E-05
1.17E-04
3.65E-04
-2.75E-04
4.51E-05
1.17E-04
3.65E-04
-2.75E-04
-1.93E-04
1.28E-04
1.59E-04
-5.45E-04
-8.00E-04
PASS
8.00E-04
PASS
-2.01E-04
1.28E-04
1.48E-04
-5.51E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.00E-04
1.27E-04
1.48E-04
-5.49E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.01E-04
1.28E-04
1.50E-04
-5.52E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.04E-04
1.30E-04
1.54E-04
-5.62E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.02E-04
1.29E-04
1.53E-04
-5.57E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.02E-04
1.29E-04
1.53E-04
-5.57E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
16
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.5. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
17
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.5. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.52E-04
-3.29E-04
9.10E-06
-1.51E-04
-1.81E-04
-2.33E-04
3.65E-05
-2.90E-04
-3.12E-04
-4.38E-05
-1.39E-04
10
-2.90E-04
-3.60E-04
-5.70E-07
-2.00E-04
-2.05E-04
-2.48E-04
2.90E-05
-3.04E-04
-3.23E-04
-5.34E-05
-1.41E-04
20
-2.90E-04
-3.61E-04
1.14E-05
-1.94E-04
-2.01E-04
-2.49E-04
2.73E-05
-3.01E-04
-3.21E-04
-5.02E-05
-1.41E-04
30
-2.92E-04
-3.61E-04
1.88E-05
-1.95E-04
-1.93E-04
-2.49E-04
2.72E-05
-3.01E-04
-3.20E-04
-5.14E-05
-1.41E-04
50
-3.02E-04
-3.72E-04
2.71E-05
-2.01E-04
-2.00E-04
-2.53E-04
2.96E-05
-3.00E-04
-3.19E-04
-4.70E-05
-1.40E-04
60
-2.98E-04
-3.67E-04
3.49E-05
-1.99E-04
-1.95E-04
-2.52E-04
3.03E-05
-3.00E-04
-3.18E-04
-4.72E-05
-1.41E-04
70
-2.98E-04
-3.67E-04
3.49E-05
-1.99E-04
-1.95E-04
-2.52E-04
3.03E-05
-3.00E-04
-3.18E-04
-4.72E-05
-1.41E-04
-1.81E-04
1.26E-04
1.66E-04
-5.27E-04
-2.11E-04
1.35E-04
1.59E-04
-5.82E-04
-2.07E-04
1.40E-04
1.77E-04
-5.91E-04
-2.05E-04
1.44E-04
1.89E-04
-5.98E-04
-2.09E-04
1.51E-04
2.04E-04
-6.23E-04
-2.05E-04
1.52E-04
2.12E-04
-6.22E-04
-2.05E-04
1.52E-04
2.12E-04
-6.22E-04
-1.69E-04
1.56E-04
2.59E-04
-5.96E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.80E-04
1.58E-04
2.54E-04
-6.13E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.79E-04
1.57E-04
2.53E-04
-6.10E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.79E-04
1.57E-04
2.51E-04
-6.09E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.78E-04
1.59E-04
2.57E-04
-6.13E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.77E-04
1.59E-04
2.57E-04
-6.12E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.77E-04
1.59E-04
2.57E-04
-6.12E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
18
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.6. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
19
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.6. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-8.60E-05
9.49E-05
-5.22E-04
-1.13E-04
-1.66E-04
-1.60E-04
-3.43E-04
-5.14E-04
1.13E-06
-2.70E-04
-1.91E-04
10
-1.20E-04
8.25E-05
-5.45E-04
-1.32E-04
-1.88E-04
-1.69E-04
-3.48E-04
-5.44E-04
-1.01E-05
-2.75E-04
-1.98E-04
20
-1.10E-04
8.35E-05
-5.35E-04
-1.25E-04
-1.79E-04
-1.68E-04
-3.44E-04
-5.43E-04
-1.19E-05
-2.77E-04
-1.96E-04
30
-1.03E-04
8.57E-05
-5.35E-04
-1.22E-04
-1.73E-04
-1.68E-04
-3.45E-04
-5.44E-04
-1.01E-05
-2.79E-04
-1.96E-04
50
-9.70E-05
8.18E-05
-5.36E-04
-1.20E-04
-1.72E-04
-1.71E-04
-3.45E-04
-5.47E-04
-1.20E-05
-2.79E-04
-1.97E-04
60
-9.00E-05
9.18E-05
-5.42E-04
-1.22E-04
-1.69E-04
-1.69E-04
-3.47E-04
-5.42E-04
-7.70E-06
-2.78E-04
-1.99E-04
70
-9.00E-05
9.18E-05
-5.42E-04
-1.22E-04
-1.69E-04
-1.69E-04
-3.47E-04
-5.42E-04
-7.70E-06
-2.78E-04
-1.99E-04
-1.58E-04
2.25E-04
4.60E-04
-7.77E-04
-1.80E-04
2.28E-04
4.45E-04
-8.06E-04
-1.73E-04
2.25E-04
4.45E-04
-7.91E-04
-1.69E-04
2.27E-04
4.52E-04
-7.91E-04
-1.69E-04
2.27E-04
4.53E-04
-7.90E-04
-1.66E-04
2.32E-04
4.70E-04
-8.03E-04
-1.66E-04
2.32E-04
4.70E-04
-8.03E-04
-2.57E-04
1.93E-04
2.73E-04
-7.87E-04
-8.00E-04
PASS
8.00E-04
PASS
-2.69E-04
1.99E-04
2.77E-04
-8.16E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.69E-04
1.98E-04
2.74E-04
-8.11E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.69E-04
1.99E-04
2.77E-04
-8.15E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.71E-04
1.99E-04
2.75E-04
-8.17E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.69E-04
1.99E-04
2.78E-04
-8.15E-04
-9.50E-04
PASS
9.50E-04
PASS
-2.69E-04
1.99E-04
2.78E-04
-8.15E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
20
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 0 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.7. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
21
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.7. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 0 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.32E-09
4.45E-09
-1.23E-09
3.69E-09
-3.30E-10
-3.32E-09
1.01E-09
-1.24E-09
-3.74E-09
-2.03E-09
-1.24E-09
10
1.28E-09
4.09E-09
-1.77E-09
3.51E-09
-6.55E-10
-3.37E-09
6.78E-10
-1.70E-09
-3.19E-09
-2.29E-09
-1.17E-09
20
1.18E-09
4.09E-09
-1.83E-09
3.28E-09
-6.03E-10
-3.48E-09
6.60E-10
-1.96E-09
-3.44E-09
-2.29E-09
-1.21E-09
30
1.20E-09
3.45E-09
-1.59E-09
3.13E-09
-6.60E-10
-3.34E-09
1.38E-10
-1.29E-09
-3.31E-09
-2.52E-09
-1.23E-09
50
1.69E-09
3.25E-09
-2.04E-09
3.00E-09
-6.31E-10
-3.81E-09
6.09E-10
-1.26E-09
-3.26E-09
-2.75E-09
-1.20E-09
60
1.63E-09
3.06E-09
-2.02E-09
3.03E-09
-6.38E-10
-3.69E-09
4.96E-10
-1.24E-09
-3.24E-09
-2.56E-09
-1.24E-09
70
1.63E-09
3.06E-09
-2.02E-09
3.03E-09
-6.38E-10
-3.69E-09
4.96E-10
-1.24E-09
-3.24E-09
-2.56E-09
-1.24E-09
1.58E-09
2.47E-09
8.34E-09
-5.18E-09
1.29E-09
2.55E-09
8.28E-09
-5.69E-09
1.22E-09
2.51E-09
8.09E-09
-5.65E-09
1.11E-09
2.23E-09
7.23E-09
-5.02E-09
1.05E-09
2.31E-09
7.40E-09
-5.29E-09
1.01E-09
2.27E-09
7.23E-09
-5.21E-09
1.01E-09
2.27E-09
7.23E-09
-5.21E-09
-1.87E-09
1.89E-09
3.31E-09
-7.04E-09
-7.00E-08
PASS
7.00E-08
PASS
-1.98E-09
1.63E-09
2.49E-09
-6.44E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.10E-09
1.69E-09
2.52E-09
-6.73E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.06E-09
1.49E-09
2.02E-09
-6.14E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.09E-09
1.79E-09
2.80E-09
-6.99E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.05E-09
1.70E-09
2.60E-09
-6.70E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.05E-09
1.70E-09
2.60E-09
-6.70E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
22
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 0 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.8. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
23
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.8. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 0 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-7.71E-09
-2.96E-10
1.03E-09
3.41E-09
4.34E-10
-7.14E-10
1.54E-09
2.47E-09
-2.56E-09
-3.00E-12
-5.16E-09
10
-9.05E-09
-3.97E-10
5.60E-10
3.37E-09
-1.52E-10
-7.79E-10
1.36E-09
2.41E-09
-2.46E-09
3.60E-11
-5.23E-09
20
-8.71E-09
-2.98E-10
5.06E-10
3.07E-09
6.00E-12
-8.60E-11
1.40E-09
2.32E-09
-2.83E-09
-1.02E-10
-5.17E-09
30
-8.45E-09
-2.68E-10
4.64E-10
3.17E-09
5.07E-10
-4.03E-10
1.30E-09
2.69E-09
-2.42E-09
-6.10E-11
-5.24E-09
50
-9.10E-09
-5.55E-10
9.90E-11
2.75E-09
3.36E-10
-7.80E-10
5.26E-10
2.34E-09
-2.40E-09
4.80E-11
-5.17E-09
60
-8.23E-09
-4.51E-10
-4.50E-11
2.76E-09
4.83E-10
-6.59E-10
9.58E-10
2.59E-09
-2.46E-09
1.79E-10
-5.26E-09
70
-8.23E-09
-4.51E-10
-4.50E-11
2.76E-09
4.83E-10
-6.59E-10
9.58E-10
2.59E-09
-2.46E-09
1.79E-10
-5.26E-09
-6.27E-10
4.19E-09
1.09E-08
-1.21E-08
-1.13E-09
4.67E-09
1.17E-08
-1.40E-08
-1.08E-09
4.47E-09
1.12E-08
-1.33E-08
-9.16E-10
4.41E-09
1.12E-08
-1.30E-08
-1.29E-09
4.54E-09
1.11E-08
-1.37E-08
-1.10E-09
4.17E-09
1.04E-08
-1.25E-08
-1.10E-09
4.17E-09
1.04E-08
-1.25E-08
1.47E-10
1.96E-09
5.53E-09
-5.24E-09
-7.00E-08
PASS
7.00E-08
PASS
1.12E-10
1.88E-09
5.28E-09
-5.05E-09
-1.00E-07
PASS
1.00E-07
PASS
1.41E-10
1.96E-09
5.50E-09
-5.22E-09
-1.00E-07
PASS
1.00E-07
PASS
2.19E-10
1.92E-09
5.47E-09
-5.04E-09
-1.00E-07
PASS
1.00E-07
PASS
-5.36E-11
1.74E-09
4.72E-09
-4.82E-09
-1.00E-07
PASS
1.00E-07
PASS
1.21E-10
1.87E-09
5.26E-09
-5.02E-09
-1.00E-07
PASS
1.00E-07
PASS
1.21E-10
1.87E-09
5.26E-09
-5.02E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
24
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 0 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.9. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
25
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.9. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 0 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.78E-09
-1.54E-09
5.21E-09
-1.63E-09
-3.24E-09
-4.79E-09
-2.35E-09
1.98E-09
2.97E-10
2.57E-09
2.86E-09
10
-2.17E-09
-1.70E-09
5.24E-09
-2.53E-09
-3.10E-09
-5.28E-09
-2.32E-09
1.91E-09
-7.10E-11
2.01E-09
2.85E-09
20
-2.48E-09
-1.66E-09
5.25E-09
-2.54E-09
-2.80E-09
-5.10E-09
-2.25E-09
1.99E-09
3.61E-10
2.45E-09
2.88E-09
30
-2.37E-09
-1.34E-09
5.31E-09
-2.69E-09
-2.76E-09
-4.82E-09
-2.05E-09
2.39E-09
4.73E-10
2.47E-09
2.85E-09
50
-2.33E-09
-1.84E-09
5.12E-09
-2.91E-09
-2.81E-09
-4.71E-09
-2.37E-09
2.55E-09
1.22E-09
2.42E-09
2.86E-09
60
-2.24E-09
-1.74E-09
5.14E-09
-2.75E-09
-2.76E-09
-4.35E-09
-1.95E-09
2.35E-09
9.39E-10
2.28E-09
2.90E-09
70
-2.24E-09
-1.74E-09
5.14E-09
-2.75E-09
-2.76E-09
-4.35E-09
-1.95E-09
2.35E-09
9.39E-10
2.28E-09
2.90E-09
-5.98E-10
3.32E-09
8.50E-09
-9.69E-09
-8.49E-10
3.44E-09
8.60E-09
-1.03E-08
-8.46E-10
3.44E-09
8.58E-09
-1.03E-08
-7.68E-10
3.45E-09
8.68E-09
-1.02E-08
-9.53E-10
3.42E-09
8.42E-09
-1.03E-08
-8.70E-10
3.38E-09
8.41E-09
-1.01E-08
-8.70E-10
3.38E-09
8.41E-09
-1.01E-08
-4.60E-10
3.09E-09
8.00E-09
-8.92E-09
-7.00E-08
PASS
7.00E-08
PASS
-7.51E-10
3.09E-09
7.71E-09
-9.22E-09
-1.00E-07
PASS
1.00E-07
PASS
-5.09E-10
3.15E-09
8.14E-09
-9.16E-09
-1.00E-07
PASS
1.00E-07
PASS
-3.09E-10
3.12E-09
8.24E-09
-8.86E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.78E-10
3.22E-09
8.65E-09
-9.01E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.46E-10
2.92E-09
7.87E-09
-8.16E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.46E-10
2.92E-09
7.87E-09
-8.16E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
26
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 0 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.10. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
27
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.10. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 0 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.85E-09
2.14E-09
-4.74E-09
-2.52E-09
-1.30E-09
-2.14E-09
9.00E-10
-1.18E-08
-3.67E-09
-4.89E-09
-1.45E-09
10
-2.27E-09
2.61E-09
-4.68E-09
-2.24E-09
-1.27E-09
-2.79E-09
8.85E-10
-1.24E-08
-3.71E-09
-4.61E-09
-1.36E-09
20
-2.31E-09
2.47E-09
-4.88E-09
-2.24E-09
-1.65E-09
-2.56E-09
5.06E-10
-1.25E-08
-3.62E-09
-4.68E-09
-1.46E-09
30
-2.17E-09
2.71E-09
-4.85E-09
-2.21E-09
-1.41E-09
-2.19E-09
9.51E-10
-1.24E-08
-3.08E-09
-5.01E-09
-1.35E-09
50
-2.25E-09
2.78E-09
-4.50E-09
-1.66E-09
-1.90E-09
-2.23E-09
1.52E-09
-1.20E-08
-3.23E-09
-4.86E-09
-1.47E-09
60
-2.34E-09
2.49E-09
-4.57E-09
-1.49E-09
-1.82E-09
-2.37E-09
1.12E-09
-1.16E-08
-3.29E-09
-4.60E-09
-1.48E-09
70
-2.34E-09
2.49E-09
-4.57E-09
-1.49E-09
-1.82E-09
-2.37E-09
1.12E-09
-1.16E-08
-3.29E-09
-4.60E-09
-1.48E-09
-1.65E-09
2.49E-09
5.18E-09
-8.49E-09
-1.57E-09
2.65E-09
5.71E-09
-8.85E-09
-1.72E-09
2.65E-09
5.55E-09
-8.99E-09
-1.58E-09
2.73E-09
5.90E-09
-9.07E-09
-1.51E-09
2.65E-09
5.76E-09
-8.77E-09
-1.54E-09
2.56E-09
5.46E-09
-8.55E-09
-1.54E-09
2.56E-09
5.46E-09
-8.55E-09
-4.33E-09
4.73E-09
8.63E-09
-1.73E-08
-7.00E-08
PASS
7.00E-08
PASS
-4.52E-09
4.86E-09
8.81E-09
-1.78E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.57E-09
4.83E-09
8.69E-09
-1.78E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.35E-09
4.99E-09
9.35E-09
-1.80E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.15E-09
4.96E-09
9.44E-09
-1.77E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.15E-09
4.68E-09
8.68E-09
-1.70E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.15E-09
4.68E-09
8.68E-09
-1.70E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
28
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.11. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
29
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.11. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.55E-07
-2.35E-07
-2.32E-07
-2.46E-07
-2.60E-07
-2.63E-07
-2.57E-07
-2.47E-07
-2.37E-07
-2.39E-07
-2.49E-07
10
-2.70E-07
-2.38E-07
-2.35E-07
-2.52E-07
-2.64E-07
-2.75E-07
-2.71E-07
-2.59E-07
-2.50E-07
-2.52E-07
-2.51E-07
20
-2.72E-07
-2.41E-07
-2.38E-07
-2.54E-07
-2.66E-07
-2.80E-07
-2.77E-07
-2.65E-07
-2.55E-07
-2.56E-07
-2.51E-07
30
-2.72E-07
-2.42E-07
-2.39E-07
-2.54E-07
-2.67E-07
-2.84E-07
-2.82E-07
-2.69E-07
-2.59E-07
-2.61E-07
-2.50E-07
50
-2.75E-07
-2.47E-07
-2.42E-07
-2.57E-07
-2.70E-07
-2.91E-07
-2.89E-07
-2.76E-07
-2.65E-07
-2.68E-07
-2.50E-07
60
-2.70E-07
-2.42E-07
-2.39E-07
-2.53E-07
-2.65E-07
-2.89E-07
-2.87E-07
-2.73E-07
-2.63E-07
-2.65E-07
-2.51E-07
70
-2.70E-07
-2.42E-07
-2.39E-07
-2.53E-07
-2.65E-07
-2.89E-07
-2.87E-07
-2.73E-07
-2.63E-07
-2.65E-07
-2.51E-07
-2.46E-07
1.22E-08
-2.12E-07
-2.79E-07
-2.52E-07
1.51E-08
-2.10E-07
-2.93E-07
-2.54E-07
1.48E-08
-2.14E-07
-2.95E-07
-2.55E-07
1.45E-08
-2.15E-07
-2.95E-07
-2.58E-07
1.42E-08
-2.19E-07
-2.97E-07
-2.54E-07
1.37E-08
-2.16E-07
-2.91E-07
-2.54E-07
1.37E-08
-2.16E-07
-2.91E-07
-2.49E-07
1.13E-08
-2.18E-07
-2.80E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.61E-07
1.15E-08
-2.30E-07
-2.93E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.67E-07
1.16E-08
-2.35E-07
-2.98E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.71E-07
1.14E-08
-2.39E-07
-3.02E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.78E-07
1.17E-08
-2.46E-07
-3.10E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.76E-07
1.18E-08
-2.43E-07
-3.08E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.76E-07
1.18E-08
-2.43E-07
-3.08E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
30
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.12. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
31
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.12. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.42E-07
-2.43E-07
-2.39E-07
-2.25E-07
-2.40E-07
-2.32E-07
-2.58E-07
-2.63E-07
-2.40E-07
-2.43E-07
-2.35E-07
10
-2.57E-07
-2.45E-07
-2.42E-07
-2.29E-07
-2.43E-07
-2.43E-07
-2.70E-07
-2.77E-07
-2.53E-07
-2.56E-07
-2.38E-07
20
-2.59E-07
-2.47E-07
-2.45E-07
-2.30E-07
-2.45E-07
-2.48E-07
-2.74E-07
-2.82E-07
-2.58E-07
-2.61E-07
-2.38E-07
30
-2.59E-07
-2.48E-07
-2.45E-07
-2.31E-07
-2.45E-07
-2.52E-07
-2.77E-07
-2.86E-07
-2.62E-07
-2.65E-07
-2.37E-07
50
-2.63E-07
-2.52E-07
-2.49E-07
-2.33E-07
-2.48E-07
-2.59E-07
-2.83E-07
-2.94E-07
-2.68E-07
-2.72E-07
-2.37E-07
60
-2.57E-07
-2.48E-07
-2.45E-07
-2.30E-07
-2.45E-07
-2.57E-07
-2.81E-07
-2.91E-07
-2.66E-07
-2.70E-07
-2.38E-07
70
-2.57E-07
-2.48E-07
-2.45E-07
-2.30E-07
-2.45E-07
-2.57E-07
-2.81E-07
-2.91E-07
-2.66E-07
-2.70E-07
-2.38E-07
-2.38E-07
7.41E-09
-2.17E-07
-2.58E-07
-2.43E-07
1.02E-08
-2.16E-07
-2.71E-07
-2.45E-07
1.04E-08
-2.17E-07
-2.74E-07
-2.46E-07
1.00E-08
-2.18E-07
-2.73E-07
-2.49E-07
1.05E-08
-2.20E-07
-2.78E-07
-2.45E-07
9.68E-09
-2.18E-07
-2.71E-07
-2.45E-07
9.68E-09
-2.18E-07
-2.71E-07
-2.47E-07
1.31E-08
-2.11E-07
-2.83E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.60E-07
1.33E-08
-2.23E-07
-2.96E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.65E-07
1.36E-08
-2.27E-07
-3.02E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.68E-07
1.36E-08
-2.31E-07
-3.06E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.75E-07
1.35E-08
-2.38E-07
-3.12E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.73E-07
1.34E-08
-2.36E-07
-3.10E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.73E-07
1.34E-08
-2.36E-07
-3.10E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
32
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.13. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
33
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.13. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.31E-07
-2.43E-07
-2.40E-07
-2.29E-07
-2.39E-07
-2.35E-07
-2.59E-07
-2.65E-07
-2.38E-07
-2.43E-07
-2.33E-07
10
-2.45E-07
-2.46E-07
-2.44E-07
-2.33E-07
-2.42E-07
-2.46E-07
-2.71E-07
-2.78E-07
-2.51E-07
-2.56E-07
-2.35E-07
20
-2.47E-07
-2.48E-07
-2.46E-07
-2.35E-07
-2.44E-07
-2.51E-07
-2.76E-07
-2.83E-07
-2.57E-07
-2.61E-07
-2.35E-07
30
-2.47E-07
-2.49E-07
-2.47E-07
-2.36E-07
-2.45E-07
-2.55E-07
-2.79E-07
-2.88E-07
-2.61E-07
-2.65E-07
-2.34E-07
50
-2.51E-07
-2.53E-07
-2.50E-07
-2.38E-07
-2.47E-07
-2.62E-07
-2.85E-07
-2.95E-07
-2.67E-07
-2.73E-07
-2.34E-07
60
-2.45E-07
-2.49E-07
-2.47E-07
-2.34E-07
-2.43E-07
-2.59E-07
-2.83E-07
-2.92E-07
-2.65E-07
-2.71E-07
-2.35E-07
70
-2.45E-07
-2.49E-07
-2.47E-07
-2.34E-07
-2.43E-07
-2.59E-07
-2.83E-07
-2.92E-07
-2.65E-07
-2.71E-07
-2.35E-07
-2.36E-07
6.03E-09
-2.20E-07
-2.53E-07
-2.42E-07
4.99E-09
-2.28E-07
-2.56E-07
-2.44E-07
5.26E-09
-2.30E-07
-2.59E-07
-2.45E-07
5.21E-09
-2.30E-07
-2.59E-07
-2.48E-07
6.11E-09
-2.31E-07
-2.65E-07
-2.44E-07
5.86E-09
-2.28E-07
-2.60E-07
-2.44E-07
5.86E-09
-2.28E-07
-2.60E-07
-2.48E-07
1.33E-08
-2.11E-07
-2.85E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.60E-07
1.34E-08
-2.24E-07
-2.97E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.66E-07
1.35E-08
-2.28E-07
-3.03E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.69E-07
1.36E-08
-2.32E-07
-3.07E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.76E-07
1.36E-08
-2.39E-07
-3.14E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.74E-07
1.34E-08
-2.37E-07
-3.11E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.74E-07
1.34E-08
-2.37E-07
-3.11E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
34
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.14. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
35
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.14. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.63E-07
-2.31E-07
-2.33E-07
-2.45E-07
-2.59E-07
-2.59E-07
-2.62E-07
-2.54E-07
-2.33E-07
-2.39E-07
-2.47E-07
10
-2.78E-07
-2.34E-07
-2.37E-07
-2.49E-07
-2.62E-07
-2.71E-07
-2.75E-07
-2.66E-07
-2.45E-07
-2.51E-07
-2.49E-07
20
-2.80E-07
-2.37E-07
-2.39E-07
-2.51E-07
-2.64E-07
-2.75E-07
-2.81E-07
-2.71E-07
-2.50E-07
-2.56E-07
-2.49E-07
30
-2.80E-07
-2.38E-07
-2.40E-07
-2.52E-07
-2.64E-07
-2.79E-07
-2.84E-07
-2.76E-07
-2.54E-07
-2.60E-07
-2.48E-07
50
-2.84E-07
-2.42E-07
-2.43E-07
-2.55E-07
-2.68E-07
-2.86E-07
-2.92E-07
-2.83E-07
-2.61E-07
-2.67E-07
-2.48E-07
60
-2.78E-07
-2.38E-07
-2.40E-07
-2.50E-07
-2.63E-07
-2.84E-07
-2.90E-07
-2.80E-07
-2.59E-07
-2.65E-07
-2.49E-07
70
-2.78E-07
-2.38E-07
-2.40E-07
-2.50E-07
-2.63E-07
-2.84E-07
-2.90E-07
-2.80E-07
-2.59E-07
-2.65E-07
-2.49E-07
-2.46E-07
1.43E-08
-2.07E-07
-2.85E-07
-2.52E-07
1.81E-08
-2.02E-07
-3.01E-07
-2.54E-07
1.80E-08
-2.05E-07
-3.04E-07
-2.55E-07
1.77E-08
-2.06E-07
-3.03E-07
-2.58E-07
1.76E-08
-2.10E-07
-3.07E-07
-2.54E-07
1.70E-08
-2.07E-07
-3.00E-07
-2.54E-07
1.70E-08
-2.07E-07
-3.00E-07
-2.49E-07
1.27E-08
-2.14E-07
-2.84E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.62E-07
1.29E-08
-2.26E-07
-2.97E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.67E-07
1.30E-08
-2.31E-07
-3.02E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.71E-07
1.28E-08
-2.35E-07
-3.06E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.78E-07
1.31E-08
-2.42E-07
-3.14E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.75E-07
1.31E-08
-2.39E-07
-3.11E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.75E-07
1.31E-08
-2.39E-07
-3.11E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
36
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.15. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
37
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.15. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.56E-07
-2.39E-07
-2.30E-07
-2.50E-07
-2.59E-07
-2.59E-07
-2.57E-07
-2.45E-07
-2.33E-07
-2.37E-07
-2.47E-07
10
-2.70E-07
-2.42E-07
-2.33E-07
-2.55E-07
-2.62E-07
-2.71E-07
-2.71E-07
-2.57E-07
-2.46E-07
-2.49E-07
-2.49E-07
20
-2.73E-07
-2.45E-07
-2.36E-07
-2.56E-07
-2.65E-07
-2.76E-07
-2.77E-07
-2.62E-07
-2.51E-07
-2.53E-07
-2.49E-07
30
-2.72E-07
-2.45E-07
-2.37E-07
-2.57E-07
-2.65E-07
-2.79E-07
-2.81E-07
-2.66E-07
-2.55E-07
-2.58E-07
-2.48E-07
50
-2.77E-07
-2.50E-07
-2.40E-07
-2.60E-07
-2.68E-07
-2.86E-07
-2.89E-07
-2.74E-07
-2.62E-07
-2.64E-07
-2.48E-07
60
-2.71E-07
-2.45E-07
-2.37E-07
-2.55E-07
-2.64E-07
-2.84E-07
-2.87E-07
-2.71E-07
-2.59E-07
-2.62E-07
-2.49E-07
70
-2.71E-07
-2.45E-07
-2.37E-07
-2.55E-07
-2.64E-07
-2.84E-07
-2.87E-07
-2.71E-07
-2.59E-07
-2.62E-07
-2.49E-07
-2.47E-07
1.22E-08
-2.13E-07
-2.80E-07
-2.52E-07
1.51E-08
-2.11E-07
-2.94E-07
-2.55E-07
1.47E-08
-2.14E-07
-2.95E-07
-2.55E-07
1.46E-08
-2.15E-07
-2.95E-07
-2.59E-07
1.46E-08
-2.19E-07
-2.99E-07
-2.54E-07
1.40E-08
-2.16E-07
-2.93E-07
-2.54E-07
1.40E-08
-2.16E-07
-2.93E-07
-2.46E-07
1.19E-08
-2.13E-07
-2.79E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.59E-07
1.21E-08
-2.26E-07
-2.92E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.64E-07
1.22E-08
-2.30E-07
-2.97E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.68E-07
1.22E-08
-2.35E-07
-3.01E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.75E-07
1.25E-08
-2.41E-07
-3.09E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.73E-07
1.24E-08
-2.38E-07
-3.07E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.73E-07
1.24E-08
-2.38E-07
-3.07E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
38
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.16. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
39
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.16. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.34E-07
-2.41E-07
-2.39E-07
-2.28E-07
-2.39E-07
-2.30E-07
-2.59E-07
-2.65E-07
-2.37E-07
-2.42E-07
-2.30E-07
10
-2.48E-07
-2.44E-07
-2.42E-07
-2.32E-07
-2.43E-07
-2.42E-07
-2.70E-07
-2.78E-07
-2.49E-07
-2.55E-07
-2.32E-07
20
-2.50E-07
-2.47E-07
-2.45E-07
-2.33E-07
-2.45E-07
-2.47E-07
-2.75E-07
-2.83E-07
-2.54E-07
-2.61E-07
-2.32E-07
30
-2.50E-07
-2.47E-07
-2.45E-07
-2.34E-07
-2.46E-07
-2.51E-07
-2.78E-07
-2.88E-07
-2.58E-07
-2.65E-07
-2.31E-07
50
-2.53E-07
-2.51E-07
-2.48E-07
-2.36E-07
-2.48E-07
-2.58E-07
-2.83E-07
-2.95E-07
-2.65E-07
-2.72E-07
-2.31E-07
60
-2.48E-07
-2.47E-07
-2.45E-07
-2.32E-07
-2.44E-07
-2.55E-07
-2.81E-07
-2.93E-07
-2.63E-07
-2.69E-07
-2.32E-07
70
-2.48E-07
-2.47E-07
-2.45E-07
-2.32E-07
-2.44E-07
-2.55E-07
-2.81E-07
-2.93E-07
-2.63E-07
-2.69E-07
-2.32E-07
-2.36E-07
5.48E-09
-2.21E-07
-2.51E-07
-2.42E-07
5.94E-09
-2.26E-07
-2.58E-07
-2.44E-07
6.46E-09
-2.26E-07
-2.62E-07
-2.44E-07
6.22E-09
-2.27E-07
-2.61E-07
-2.47E-07
6.76E-09
-2.29E-07
-2.66E-07
-2.43E-07
6.30E-09
-2.26E-07
-2.60E-07
-2.43E-07
6.30E-09
-2.26E-07
-2.60E-07
-2.47E-07
1.48E-08
-2.06E-07
-2.87E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.59E-07
1.48E-08
-2.18E-07
-3.00E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.64E-07
1.49E-08
-2.23E-07
-3.05E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.68E-07
1.49E-08
-2.27E-07
-3.09E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.75E-07
1.48E-08
-2.34E-07
-3.15E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.72E-07
1.49E-08
-2.32E-07
-3.13E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.72E-07
1.49E-08
-2.32E-07
-3.13E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
40
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.17. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
41
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.17. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.29E-07
-2.41E-07
-2.45E-07
-2.27E-07
-2.35E-07
-2.29E-07
-2.56E-07
-2.66E-07
-2.38E-07
-2.45E-07
-2.35E-07
10
-2.42E-07
-2.44E-07
-2.48E-07
-2.31E-07
-2.39E-07
-2.41E-07
-2.68E-07
-2.79E-07
-2.51E-07
-2.57E-07
-2.37E-07
20
-2.44E-07
-2.47E-07
-2.51E-07
-2.32E-07
-2.41E-07
-2.45E-07
-2.72E-07
-2.84E-07
-2.56E-07
-2.63E-07
-2.37E-07
30
-2.44E-07
-2.47E-07
-2.51E-07
-2.33E-07
-2.42E-07
-2.49E-07
-2.76E-07
-2.89E-07
-2.60E-07
-2.67E-07
-2.37E-07
50
-2.48E-07
-2.51E-07
-2.55E-07
-2.35E-07
-2.44E-07
-2.56E-07
-2.82E-07
-2.97E-07
-2.68E-07
-2.75E-07
-2.36E-07
60
-2.43E-07
-2.47E-07
-2.51E-07
-2.31E-07
-2.40E-07
-2.54E-07
-2.80E-07
-2.94E-07
-2.65E-07
-2.72E-07
-2.37E-07
70
-2.43E-07
-2.47E-07
-2.51E-07
-2.31E-07
-2.40E-07
-2.54E-07
-2.80E-07
-2.94E-07
-2.65E-07
-2.72E-07
-2.37E-07
-2.35E-07
7.69E-09
-2.14E-07
-2.56E-07
-2.41E-07
6.53E-09
-2.23E-07
-2.59E-07
-2.43E-07
7.07E-09
-2.24E-07
-2.62E-07
-2.43E-07
6.98E-09
-2.24E-07
-2.63E-07
-2.47E-07
7.82E-09
-2.25E-07
-2.68E-07
-2.42E-07
7.72E-09
-2.21E-07
-2.64E-07
-2.42E-07
7.72E-09
-2.21E-07
-2.64E-07
-2.47E-07
1.45E-08
-2.07E-07
-2.86E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.59E-07
1.49E-08
-2.18E-07
-3.00E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.64E-07
1.49E-08
-2.23E-07
-3.05E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.68E-07
1.52E-08
-2.27E-07
-3.10E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.75E-07
1.51E-08
-2.34E-07
-3.17E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.73E-07
1.49E-08
-2.32E-07
-3.14E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.73E-07
1.49E-08
-2.32E-07
-3.14E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
42
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.18. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
43
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.18. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.61E-07
-2.33E-07
-2.28E-07
-2.42E-07
-2.57E-07
-2.56E-07
-2.62E-07
-2.42E-07
-2.29E-07
-2.34E-07
-2.45E-07
10
-2.75E-07
-2.36E-07
-2.32E-07
-2.47E-07
-2.60E-07
-2.68E-07
-2.75E-07
-2.53E-07
-2.41E-07
-2.46E-07
-2.47E-07
20
-2.77E-07
-2.39E-07
-2.34E-07
-2.48E-07
-2.62E-07
-2.72E-07
-2.80E-07
-2.59E-07
-2.46E-07
-2.51E-07
-2.47E-07
30
-2.77E-07
-2.40E-07
-2.34E-07
-2.49E-07
-2.62E-07
-2.76E-07
-2.84E-07
-2.63E-07
-2.51E-07
-2.54E-07
-2.46E-07
50
-2.81E-07
-2.44E-07
-2.39E-07
-2.52E-07
-2.65E-07
-2.83E-07
-2.92E-07
-2.70E-07
-2.57E-07
-2.61E-07
-2.46E-07
60
-2.75E-07
-2.40E-07
-2.35E-07
-2.48E-07
-2.61E-07
-2.81E-07
-2.90E-07
-2.68E-07
-2.55E-07
-2.59E-07
-2.47E-07
70
-2.75E-07
-2.40E-07
-2.35E-07
-2.48E-07
-2.61E-07
-2.81E-07
-2.90E-07
-2.68E-07
-2.55E-07
-2.59E-07
-2.47E-07
-2.44E-07
1.45E-08
-2.04E-07
-2.84E-07
-2.50E-07
1.77E-08
-2.01E-07
-2.98E-07
-2.52E-07
1.78E-08
-2.03E-07
-3.01E-07
-2.52E-07
1.74E-08
-2.05E-07
-3.00E-07
-2.56E-07
1.71E-08
-2.09E-07
-3.03E-07
-2.52E-07
1.65E-08
-2.06E-07
-2.97E-07
-2.52E-07
1.65E-08
-2.06E-07
-2.97E-07
-2.44E-07
1.42E-08
-2.05E-07
-2.83E-07
-7.15E-07
PASS
7.15E-07
PASS
-2.57E-07
1.44E-08
-2.17E-07
-2.96E-07
-7.65E-07
PASS
7.65E-07
PASS
-2.62E-07
1.43E-08
-2.22E-07
-3.01E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.66E-07
1.43E-08
-2.26E-07
-3.05E-07
-8.15E-07
PASS
8.15E-07
PASS
-2.73E-07
1.47E-08
-2.32E-07
-3.13E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.70E-07
1.45E-08
-2.31E-07
-3.10E-07
-8.65E-07
PASS
8.65E-07
PASS
-2.70E-07
1.45E-08
-2.31E-07
-3.10E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
44
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.19. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
45
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.19. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.84E-05
5.88E-05
2.70E-05
2.35E-04
-1.60E-04
1.09E-04
-9.71E-05
-6.24E-06
2.98E-04
-1.21E-04
-2.56E-04
10
4.00E-05
3.93E-05
4.99E-06
2.23E-04
-1.76E-04
1.01E-04
-1.06E-04
-1.63E-05
2.88E-04
-1.25E-04
-2.56E-04
20
5.33E-05
3.25E-05
8.01E-06
2.33E-04
-1.67E-04
1.02E-04
-1.07E-04
-1.57E-05
2.91E-04
-1.21E-04
-2.57E-04
30
5.90E-05
2.72E-05
9.33E-06
2.34E-04
-1.65E-04
1.01E-04
-1.09E-04
-1.49E-05
2.93E-04
-1.19E-04
-2.57E-04
50
5.80E-05
2.29E-05
5.47E-06
2.36E-04
-1.61E-04
1.05E-04
-1.08E-04
-1.36E-05
2.94E-04
-1.18E-04
-2.57E-04
60
6.01E-05
2.25E-05
4.26E-06
2.44E-04
-1.62E-04
1.06E-04
-1.06E-04
-1.33E-05
2.93E-04
-1.18E-04
-2.58E-04
70
6.01E-05
2.25E-05
4.26E-06
2.44E-04
-1.62E-04
1.06E-04
-1.06E-04
-1.33E-05
2.93E-04
-1.18E-04
-2.58E-04
4.38E-05
1.41E-04
4.29E-04
-3.42E-04
2.63E-05
1.42E-04
4.15E-04
-3.63E-04
3.19E-05
1.42E-04
4.22E-04
-3.58E-04
3.27E-05
1.42E-04
4.23E-04
-3.57E-04
3.22E-05
1.42E-04
4.21E-04
-3.57E-04
3.37E-05
1.45E-04
4.32E-04
-3.64E-04
3.37E-05
1.45E-04
4.32E-04
-3.64E-04
3.64E-05
1.72E-04
5.08E-04
-4.35E-04
-8.00E-04
PASS
8.00E-04
PASS
2.84E-05
1.71E-04
4.96E-04
-4.39E-04
-9.50E-04
PASS
9.50E-04
PASS
2.97E-05
1.71E-04
4.99E-04
-4.39E-04
-9.50E-04
PASS
9.50E-04
PASS
3.01E-05
1.71E-04
5.00E-04
-4.40E-04
-9.50E-04
PASS
9.50E-04
PASS
3.18E-05
1.72E-04
5.04E-04
-4.40E-04
-9.50E-04
PASS
9.50E-04
PASS
3.21E-05
1.71E-04
5.02E-04
-4.38E-04
-9.50E-04
PASS
9.50E-04
PASS
3.21E-05
1.71E-04
5.02E-04
-4.38E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
46
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.20. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
47
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.20. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.24E-04
2.02E-04
3.06E-04
1.04E-04
3.39E-04
-7.20E-06
2.33E-04
-1.30E-04
-4.55E-05
4.27E-06
-1.50E-04
10
1.94E-04
1.86E-04
2.91E-04
7.88E-05
3.13E-04
-1.63E-05
2.34E-04
-1.36E-04
-4.77E-05
-7.09E-06
-1.51E-04
20
2.09E-04
1.94E-04
2.95E-04
8.58E-05
3.11E-04
-1.31E-05
2.36E-04
-1.34E-04
-4.76E-05
-6.12E-06
-1.50E-04
30
2.12E-04
1.98E-04
2.98E-04
8.80E-05
3.16E-04
-1.54E-05
2.38E-04
-1.33E-04
-4.25E-05
-5.52E-06
-1.51E-04
50
2.12E-04
2.04E-04
3.00E-04
8.27E-05
3.09E-04
-1.94E-05
2.43E-04
-1.33E-04
-4.59E-05
-3.46E-06
-1.51E-04
60
2.21E-04
2.08E-04
3.04E-04
9.64E-05
3.21E-04
-1.50E-05
2.43E-04
-1.34E-04
-4.44E-05
-3.59E-06
-1.52E-04
70
2.21E-04
2.08E-04
3.04E-04
9.64E-05
3.21E-04
-1.50E-05
2.43E-04
-1.34E-04
-4.44E-05
-3.59E-06
-1.52E-04
2.35E-04
9.26E-05
4.89E-04
-1.88E-05
2.12E-04
9.38E-05
4.70E-04
-4.47E-05
2.19E-04
9.05E-05
4.67E-04
-2.93E-05
2.22E-04
9.12E-05
4.73E-04
-2.76E-05
2.21E-04
9.14E-05
4.72E-04
-2.93E-05
2.30E-04
8.95E-05
4.76E-04
-1.54E-05
2.30E-04
8.95E-05
4.76E-04
-1.54E-05
1.10E-05
1.35E-04
3.81E-04
-3.59E-04
-8.00E-04
PASS
8.00E-04
PASS
5.23E-06
1.38E-04
3.82E-04
-3.72E-04
-9.50E-04
PASS
9.50E-04
PASS
6.90E-06
1.38E-04
3.84E-04
-3.70E-04
-9.50E-04
PASS
9.50E-04
PASS
8.44E-06
1.38E-04
3.87E-04
-3.70E-04
-9.50E-04
PASS
9.50E-04
PASS
8.28E-06
1.40E-04
3.93E-04
-3.77E-04
-9.50E-04
PASS
9.50E-04
PASS
9.25E-06
1.40E-04
3.94E-04
-3.75E-04
-9.50E-04
PASS
9.50E-04
PASS
9.25E-06
1.40E-04
3.94E-04
-3.75E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
48
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.21. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
49
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.21. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.29E-06
-7.57E-06
2.10E-04
2.09E-04
-5.75E-06
9.56E-05
2.12E-04
-8.17E-06
-1.93E-04
2.44E-04
1.09E-04
10
-2.11E-05
-4.59E-05
1.97E-04
1.62E-04
-2.98E-05
8.33E-05
2.06E-04
-1.87E-05
-2.01E-04
2.36E-04
1.07E-04
20
-1.80E-05
-5.01E-05
2.03E-04
1.66E-04
-2.52E-05
8.51E-05
2.05E-04
-1.71E-05
-1.99E-04
2.39E-04
1.07E-04
30
-1.86E-05
-5.13E-05
2.09E-04
1.69E-04
-1.56E-05
8.64E-05
2.09E-04
-1.60E-05
-2.00E-04
2.38E-04
1.07E-04
50
-2.32E-05
-6.59E-05
2.08E-04
1.64E-04
-1.81E-05
8.73E-05
2.10E-04
-1.62E-05
-1.95E-04
2.39E-04
1.07E-04
60
-2.03E-05
-6.02E-05
2.17E-04
1.70E-04
-1.74E-05
8.72E-05
2.10E-04
-1.29E-05
-1.95E-04
2.41E-04
1.04E-04
70
-2.03E-05
-6.02E-05
2.17E-04
1.70E-04
-1.74E-05
8.72E-05
2.10E-04
-1.29E-05
-1.95E-04
2.41E-04
1.04E-04
8.25E-05
1.16E-04
4.00E-04
-2.35E-04
5.24E-05
1.17E-04
3.73E-04
-2.68E-04
5.51E-05
1.19E-04
3.82E-04
-2.72E-04
5.86E-05
1.21E-04
3.90E-04
-2.73E-04
5.31E-05
1.24E-04
3.93E-04
-2.87E-04
5.77E-05
1.26E-04
4.03E-04
-2.88E-04
5.77E-05
1.26E-04
4.03E-04
-2.88E-04
7.00E-05
1.78E-04
5.58E-04
-4.18E-04
-8.00E-04
PASS
8.00E-04
PASS
6.13E-05
1.78E-04
5.50E-04
-4.28E-04
-9.50E-04
PASS
9.50E-04
PASS
6.28E-05
1.78E-04
5.51E-04
-4.25E-04
-9.50E-04
PASS
9.50E-04
PASS
6.36E-05
1.79E-04
5.54E-04
-4.26E-04
-9.50E-04
PASS
9.50E-04
PASS
6.49E-05
1.78E-04
5.52E-04
-4.22E-04
-9.50E-04
PASS
9.50E-04
PASS
6.60E-05
1.78E-04
5.53E-04
-4.21E-04
-9.50E-04
PASS
9.50E-04
PASS
6.60E-05
1.78E-04
5.53E-04
-4.21E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
50
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.22. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
51
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.22. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.63E-05
2.49E-04
-1.96E-04
2.01E-04
-1.30E-04
6.07E-05
-1.74E-04
1.09E-04
3.65E-04
-4.04E-05
4.39E-05
10
2.47E-05
2.36E-04
-2.21E-04
1.84E-04
-1.51E-04
5.28E-05
-1.80E-04
1.04E-04
3.52E-04
-4.19E-05
3.99E-05
20
3.68E-05
2.39E-04
-2.13E-04
1.92E-04
-1.41E-04
5.52E-05
-1.79E-04
1.06E-04
3.52E-04
-4.20E-05
4.06E-05
30
4.53E-05
2.41E-04
-2.11E-04
1.98E-04
-1.35E-04
5.35E-05
-1.79E-04
1.09E-04
3.55E-04
-4.29E-05
3.99E-05
50
5.56E-05
2.37E-04
-2.13E-04
2.02E-04
-1.29E-04
5.33E-05
-1.82E-04
1.12E-04
3.56E-04
-4.28E-05
3.86E-05
60
5.85E-05
2.47E-04
-2.17E-04
2.04E-04
-1.31E-04
5.60E-05
-1.80E-04
1.14E-04
3.61E-04
-4.24E-05
3.83E-05
70
5.85E-05
2.47E-04
-2.17E-04
2.04E-04
-1.31E-04
5.60E-05
-1.80E-04
1.14E-04
3.61E-04
-4.24E-05
3.83E-05
3.42E-05
1.96E-04
5.73E-04
-5.04E-04
1.45E-05
2.00E-04
5.63E-04
-5.34E-04
2.27E-05
1.99E-04
5.67E-04
-5.22E-04
2.76E-05
1.99E-04
5.73E-04
-5.18E-04
3.05E-05
1.98E-04
5.74E-04
-5.13E-04
3.24E-05
2.03E-04
5.89E-04
-5.24E-04
3.24E-05
2.03E-04
5.89E-04
-5.24E-04
6.41E-05
2.00E-04
6.13E-04
-4.84E-04
-8.00E-04
PASS
8.00E-04
PASS
5.74E-05
1.97E-04
5.98E-04
-4.83E-04
-9.50E-04
PASS
9.50E-04
PASS
5.85E-05
1.97E-04
5.99E-04
-4.82E-04
-9.50E-04
PASS
9.50E-04
PASS
5.93E-05
1.98E-04
6.03E-04
-4.84E-04
-9.50E-04
PASS
9.50E-04
PASS
5.91E-05
2.00E-04
6.06E-04
-4.88E-04
-9.50E-04
PASS
9.50E-04
PASS
6.16E-05
2.01E-04
6.13E-04
-4.90E-04
-9.50E-04
PASS
9.50E-04
PASS
6.16E-05
2.01E-04
6.13E-04
-4.90E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
52
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 15 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.23. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
53
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.23. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.07E-09
7.47E-09
5.81E-09
-4.42E-09
4.31E-09
-9.17E-09
-2.34E-08
-2.09E-09
-2.76E-09
6.75E-09
-6.11E-09
10
4.34E-09
7.43E-09
5.78E-09
-3.54E-09
8.77E-09
-9.14E-09
-2.52E-08
-1.14E-09
-3.88E-09
8.87E-09
-6.13E-09
20
4.13E-09
5.89E-09
4.57E-09
-4.40E-09
1.02E-08
-9.38E-09
-2.59E-08
-1.32E-09
-3.16E-09
9.82E-09
-6.17E-09
30
4.16E-09
4.95E-09
4.36E-09
-5.10E-09
7.42E-09
-9.29E-09
-2.58E-08
-1.78E-09
-4.46E-09
9.58E-09
-6.16E-09
50
4.89E-09
4.86E-09
4.65E-09
-5.33E-09
7.07E-09
-9.45E-09
-2.70E-08
-3.00E-09
-3.65E-09
8.02E-09
-6.00E-09
60
4.39E-09
4.21E-09
4.26E-09
-4.68E-09
6.85E-09
-7.38E-09
-2.53E-08
-2.11E-09
-3.06E-09
8.90E-09
-6.10E-09
70
4.39E-09
4.21E-09
4.26E-09
-4.68E-09
6.85E-09
-7.38E-09
-2.53E-08
-2.11E-09
-3.06E-09
8.90E-09
-6.10E-09
3.45E-09
4.60E-09
1.61E-08
-9.17E-09
4.55E-09
4.82E-09
1.78E-08
-8.67E-09
4.07E-09
5.30E-09
1.86E-08
-1.05E-08
3.16E-09
4.80E-09
1.63E-08
-1.00E-08
3.23E-09
4.88E-09
1.66E-08
-1.02E-08
3.00E-09
4.44E-09
1.52E-08
-9.17E-09
3.00E-09
4.44E-09
1.52E-08
-9.17E-09
-6.12E-09
1.12E-08
2.45E-08
-3.68E-08
-7.00E-08
PASS
7.00E-08
PASS
-6.09E-09
1.25E-08
2.82E-08
-4.04E-08
-1.00E-07
PASS
1.00E-07
PASS
-5.99E-09
1.31E-08
3.00E-08
-4.20E-08
-1.00E-07
PASS
1.00E-07
PASS
-6.36E-09
1.29E-08
2.91E-08
-4.18E-08
-1.00E-07
PASS
1.00E-07
PASS
-7.01E-09
1.28E-08
2.81E-08
-4.22E-08
-1.00E-07
PASS
1.00E-07
PASS
-5.78E-09
1.24E-08
2.83E-08
-3.99E-08
-1.00E-07
PASS
1.00E-07
PASS
-5.78E-09
1.24E-08
2.83E-08
-3.99E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
54
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 15 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.24. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
55
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.24. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.08E-08
-1.98E-08
-1.56E-09
2.80E-09
4.47E-09
1.85E-09
1.25E-08
-4.43E-09
8.91E-10
-5.65E-09
-3.79E-10
10
1.21E-08
-1.69E-08
-3.73E-10
3.02E-09
5.30E-09
5.70E-09
1.32E-08
-3.27E-09
-1.62E-09
-6.08E-09
-5.01E-10
20
1.15E-08
-1.82E-08
-9.33E-10
2.42E-09
4.19E-09
4.75E-09
1.33E-08
-3.74E-09
-3.23E-09
-6.53E-09
-5.45E-10
30
1.09E-08
-1.85E-08
-1.70E-11
1.59E-09
3.22E-09
4.50E-09
1.36E-08
-3.52E-09
-5.07E-10
-5.08E-09
-4.29E-10
50
1.19E-08
-1.14E-08
1.95E-10
1.36E-09
4.26E-09
4.33E-09
1.44E-08
-4.04E-09
-3.04E-09
-3.75E-09
-4.27E-10
60
1.38E-08
-1.11E-08
2.12E-10
1.09E-09
3.60E-09
4.23E-09
1.40E-08
-4.48E-09
-4.83E-10
-3.30E-09
-5.47E-10
70
1.38E-08
-1.11E-08
2.12E-10
1.09E-09
3.60E-09
4.23E-09
1.40E-08
-4.48E-09
-4.83E-10
-3.30E-09
-5.47E-10
-6.56E-10
1.16E-08
3.10E-08
-3.24E-08
6.29E-10
1.08E-08
3.02E-08
-2.89E-08
-2.06E-10
1.10E-08
3.00E-08
-3.04E-08
-5.62E-10
1.09E-08
2.93E-08
-3.04E-08
1.28E-09
8.42E-09
2.44E-08
-2.18E-08
1.50E-09
8.89E-09
2.59E-08
-2.29E-08
1.50E-09
8.89E-09
2.59E-08
-2.29E-08
1.03E-09
7.18E-09
2.07E-08
-1.87E-08
-7.00E-08
PASS
7.00E-08
PASS
1.59E-09
7.83E-09
2.30E-08
-1.99E-08
-1.00E-07
PASS
1.00E-07
PASS
9.12E-10
8.10E-09
2.31E-08
-2.13E-08
-1.00E-07
PASS
1.00E-07
PASS
1.81E-09
7.55E-09
2.25E-08
-1.89E-08
-1.00E-07
PASS
1.00E-07
PASS
1.57E-09
7.94E-09
2.34E-08
-2.02E-08
-1.00E-07
PASS
1.00E-07
PASS
2.00E-09
7.52E-09
2.26E-08
-1.86E-08
-1.00E-07
PASS
1.00E-07
PASS
2.00E-09
7.52E-09
2.26E-08
-1.86E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
56
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 15 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.25. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
57
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.25. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.63E-09
-1.69E-08
-1.37E-08
9.58E-09
-3.52E-09
-7.63E-10
4.08E-09
-3.45E-09
-1.15E-09
7.11E-10
-2.37E-09
10
8.96E-09
-1.63E-08
-1.25E-08
8.40E-09
-4.26E-09
-9.12E-10
4.09E-09
-2.52E-09
-1.09E-09
8.37E-10
-2.48E-09
20
8.78E-09
-1.69E-08
-1.28E-08
7.25E-09
-4.99E-09
-5.12E-10
3.37E-09
-3.08E-09
-6.70E-11
1.21E-09
-2.39E-09
30
8.04E-09
-1.55E-08
-1.23E-08
7.52E-09
-4.08E-09
-3.73E-10
5.29E-09
-9.68E-10
-3.20E-11
8.50E-11
-2.52E-09
50
8.22E-09
-1.67E-08
-1.37E-08
7.45E-09
-4.28E-09
4.58E-10
3.28E-09
-2.26E-09
5.37E-10
-8.50E-10
-2.34E-09
60
7.40E-09
-1.59E-08
-1.26E-08
7.25E-09
-4.45E-09
1.43E-10
4.56E-09
-1.73E-09
1.71E-09
-6.09E-10
-2.50E-09
70
7.40E-09
-1.59E-08
-1.26E-08
7.25E-09
-4.45E-09
1.43E-10
4.56E-09
-1.73E-09
1.71E-09
-6.09E-10
-2.50E-09
-3.60E-09
1.18E-08
2.88E-08
-3.60E-08
-3.14E-09
1.16E-08
2.88E-08
-3.51E-08
-3.72E-09
1.16E-08
2.79E-08
-3.54E-08
-3.26E-09
1.09E-08
2.66E-08
-3.31E-08
-3.80E-09
1.16E-08
2.79E-08
-3.55E-08
-3.66E-09
1.09E-08
2.61E-08
-3.34E-08
-3.66E-09
1.09E-08
2.61E-08
-3.34E-08
-1.15E-10
2.78E-09
7.50E-09
-7.73E-09
-7.00E-08
PASS
7.00E-08
PASS
8.10E-11
2.54E-09
7.04E-09
-6.88E-09
-1.00E-07
PASS
1.00E-07
PASS
1.84E-10
2.37E-09
6.67E-09
-6.30E-09
-1.00E-07
PASS
1.00E-07
PASS
8.00E-10
2.54E-09
7.77E-09
-6.17E-09
-1.00E-07
PASS
1.00E-07
PASS
2.34E-10
2.05E-09
5.85E-09
-5.39E-09
-1.00E-07
PASS
1.00E-07
PASS
8.14E-10
2.44E-09
7.50E-09
-5.87E-09
-1.00E-07
PASS
1.00E-07
PASS
8.14E-10
2.44E-09
7.50E-09
-5.87E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
58
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= 15 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.26. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
59
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.26. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= 15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.18E-09
-1.80E-09
-6.02E-09
-8.54E-09
6.26E-09
-8.51E-09
-1.70E-10
1.19E-08
1.19E-09
-8.85E-09
-5.22E-09
10
1.05E-08
-8.73E-10
-5.42E-09
-9.35E-09
6.06E-09
-8.39E-09
-7.85E-10
1.18E-08
1.07E-10
-7.37E-09
-5.32E-09
20
1.02E-08
-8.04E-10
-6.02E-09
-9.53E-09
5.68E-09
-7.65E-09
-1.06E-09
1.11E-08
-1.30E-11
-7.15E-09
-5.25E-09
30
9.78E-09
-1.30E-09
-5.30E-09
-8.74E-09
5.28E-09
-8.54E-09
-7.15E-10
1.15E-08
-1.70E-11
-8.18E-09
-5.17E-09
50
1.02E-08
-1.83E-09
-5.60E-09
-9.51E-09
5.79E-09
-9.11E-09
-1.86E-09
1.03E-08
2.07E-09
-8.76E-09
-5.20E-09
60
9.44E-09
-1.35E-09
-5.03E-09
-8.49E-09
5.51E-09
-7.74E-09
-1.70E-09
1.04E-08
1.77E-09
-8.41E-09
-5.20E-09
70
9.44E-09
-1.35E-09
-5.03E-09
-8.49E-09
5.51E-09
-7.74E-09
-1.70E-09
1.04E-08
1.77E-09
-8.41E-09
-5.20E-09
-1.84E-10
7.68E-09
2.09E-08
-2.12E-08
1.81E-10
8.12E-09
2.25E-08
-2.21E-08
-9.58E-11
8.12E-09
2.22E-08
-2.24E-08
-5.60E-11
7.57E-09
2.07E-08
-2.08E-08
-1.91E-10
8.10E-09
2.20E-08
-2.24E-08
1.38E-11
7.40E-09
2.03E-08
-2.03E-08
1.38E-11
7.40E-09
2.03E-08
-2.03E-08
-8.87E-10
8.51E-09
2.25E-08
-2.42E-08
-7.00E-08
PASS
7.00E-08
PASS
-9.28E-10
8.07E-09
2.12E-08
-2.30E-08
-1.00E-07
PASS
1.00E-07
PASS
-9.46E-10
7.59E-09
1.99E-08
-2.18E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.20E-09
8.14E-09
2.11E-08
-2.35E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.47E-09
8.10E-09
2.07E-08
-2.37E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.14E-09
7.71E-09
2.00E-08
-2.23E-08
-1.00E-07
PASS
1.00E-07
PASS
-1.14E-09
7.71E-09
2.00E-08
-2.23E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
60
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.27. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
61
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.27. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.43E-07
3.58E-07
3.55E-07
3.80E-07
3.96E-07
4.21E-07
3.86E-07
3.65E-07
3.86E-07
3.65E-07
4.01E-07
10
4.88E-07
3.77E-07
3.71E-07
3.96E-07
4.20E-07
4.63E-07
4.34E-07
4.09E-07
4.36E-07
4.07E-07
4.05E-07
20
5.10E-07
3.88E-07
3.82E-07
4.07E-07
4.32E-07
4.88E-07
4.60E-07
4.33E-07
4.63E-07
4.31E-07
4.06E-07
30
5.23E-07
3.96E-07
3.89E-07
4.14E-07
4.37E-07
5.05E-07
4.80E-07
4.50E-07
4.82E-07
4.49E-07
4.06E-07
50
5.51E-07
4.14E-07
4.07E-07
4.28E-07
4.52E-07
5.37E-07
5.14E-07
4.81E-07
5.16E-07
4.80E-07
4.07E-07
60
5.47E-07
4.11E-07
4.05E-07
4.25E-07
4.48E-07
5.35E-07
5.10E-07
4.77E-07
5.10E-07
4.74E-07
4.07E-07
70
5.47E-07
4.11E-07
4.05E-07
4.25E-07
4.48E-07
5.35E-07
5.10E-07
4.77E-07
5.10E-07
4.74E-07
4.07E-07
3.87E-07
3.60E-08
4.85E-07
2.88E-07
4.10E-07
4.73E-08
5.40E-07
2.81E-07
4.24E-07
5.20E-08
5.66E-07
2.81E-07
4.32E-07
5.44E-08
5.81E-07
2.82E-07
4.50E-07
5.89E-08
6.12E-07
2.89E-07
4.47E-07
5.83E-08
6.07E-07
2.87E-07
4.47E-07
5.83E-08
6.07E-07
2.87E-07
3.84E-07
2.27E-08
4.47E-07
3.22E-07
-7.15E-07
PASS
7.15E-07
PASS
4.30E-07
2.30E-08
4.93E-07
3.67E-07
-7.65E-07
PASS
7.65E-07
PASS
4.55E-07
2.37E-08
5.20E-07
3.90E-07
-8.15E-07
PASS
8.15E-07
PASS
4.73E-07 5.06E-07 5.01E-07
2.40E-08 2.47E-08 2.56E-08
5.39E-07 5.74E-07 5.71E-07
4.07E-07 4.38E-07 4.31E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
5.01E-07
2.56E-08
5.71E-07
4.31E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
62
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.28. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
63
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.28. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.12E-07
4.02E-07
3.90E-07
3.84E-07
4.24E-07
3.29E-07
4.07E-07
4.34E-07
3.93E-07
3.68E-07
3.62E-07
10
4.54E-07
4.23E-07
4.10E-07
4.03E-07
4.44E-07
3.69E-07
4.46E-07
4.88E-07
4.45E-07
4.12E-07
3.65E-07
20
4.72E-07
4.37E-07
4.20E-07
4.12E-07
4.54E-07
3.90E-07
4.69E-07
5.11E-07
4.73E-07
4.39E-07
3.63E-07
30
4.86E-07
4.46E-07
4.28E-07
4.21E-07
4.62E-07
4.08E-07
4.89E-07
5.31E-07
4.91E-07
4.58E-07
3.61E-07
50
5.13E-07
4.65E-07
4.47E-07
4.36E-07
4.80E-07
4.35E-07
5.18E-07
5.66E-07
5.24E-07
4.92E-07
3.62E-07
60
5.10E-07
4.62E-07
4.45E-07
4.33E-07
4.78E-07
4.31E-07
5.14E-07
5.60E-07
5.20E-07
4.86E-07
3.63E-07
70
5.10E-07
4.62E-07
4.45E-07
4.33E-07
4.78E-07
4.31E-07
5.14E-07
5.60E-07
5.20E-07
4.86E-07
3.63E-07
4.02E-07
1.62E-08
4.47E-07
3.58E-07
4.27E-07
2.20E-08
4.87E-07
3.66E-07
4.39E-07
2.46E-08
5.07E-07
3.72E-07
4.49E-07
2.63E-08
5.21E-07
3.77E-07
4.68E-07
3.05E-08
5.52E-07
3.85E-07
4.66E-07
2.99E-08
5.48E-07
3.83E-07
4.66E-07
2.99E-08
5.48E-07
3.83E-07
3.86E-07
3.98E-08
4.96E-07
2.77E-07
-7.15E-07
PASS
7.15E-07
PASS
4.32E-07
4.44E-08
5.54E-07
3.10E-07
-7.65E-07
PASS
7.65E-07
PASS
4.56E-07
4.51E-08
5.80E-07
3.32E-07
-8.15E-07
PASS
8.15E-07
PASS
4.75E-07 5.07E-07 5.02E-07
4.58E-08 4.82E-08 4.80E-08
6.01E-07 6.39E-07 6.34E-07
3.50E-07 3.75E-07 3.71E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
5.02E-07
4.80E-08
6.34E-07
3.71E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
64
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.29. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
65
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.29. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.00E-07
4.03E-07
3.90E-07
3.89E-07
4.05E-07
3.37E-07
3.92E-07
4.43E-07
3.92E-07
3.67E-07
3.55E-07
10
4.45E-07
4.26E-07
4.05E-07
4.08E-07
4.26E-07
3.72E-07
4.32E-07
4.92E-07
4.41E-07
4.13E-07
3.57E-07
20
4.63E-07
4.39E-07
4.15E-07
4.18E-07
4.40E-07
3.94E-07
4.56E-07
5.17E-07
4.69E-07
4.39E-07
3.56E-07
30
4.77E-07
4.47E-07
4.23E-07
4.26E-07
4.49E-07
4.11E-07
4.75E-07
5.39E-07
4.90E-07
4.58E-07
3.57E-07
50
5.03E-07
4.65E-07
4.40E-07
4.42E-07
4.65E-07
4.41E-07
5.07E-07
5.74E-07
5.24E-07
4.91E-07
3.59E-07
60
4.98E-07
4.63E-07
4.37E-07
4.40E-07
4.63E-07
4.37E-07
5.01E-07
5.69E-07
5.20E-07
4.86E-07
3.58E-07
70
4.98E-07
4.63E-07
4.37E-07
4.40E-07
4.63E-07
4.37E-07
5.01E-07
5.69E-07
5.20E-07
4.86E-07
3.58E-07
3.98E-07
7.48E-09
4.18E-07
3.77E-07
4.22E-07
1.62E-08
4.66E-07
3.77E-07
4.35E-07
1.94E-08
4.88E-07
3.82E-07
4.44E-07
2.19E-08
5.04E-07
3.84E-07
4.63E-07
2.54E-08
5.33E-07
3.94E-07
4.60E-07
2.45E-08
5.27E-07
3.93E-07
4.60E-07
2.45E-08
5.27E-07
3.93E-07
3.86E-07
3.90E-08
4.93E-07
2.79E-07
-7.15E-07
PASS
7.15E-07
PASS
4.30E-07
4.37E-08
5.50E-07
3.10E-07
-7.65E-07
PASS
7.65E-07
PASS
4.55E-07
4.49E-08
5.78E-07
3.32E-07
-8.15E-07
PASS
8.15E-07
PASS
4.75E-07 5.07E-07 5.03E-07
4.67E-08 4.84E-08 4.81E-08
6.03E-07 6.40E-07 6.34E-07
3.47E-07 3.75E-07 3.71E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
5.03E-07
4.81E-08
6.34E-07
3.71E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
66
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.30. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
67
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.30. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.46E-07
3.51E-07
3.46E-07
3.81E-07
4.05E-07
4.11E-07
3.94E-07
3.73E-07
3.86E-07
3.52E-07
4.03E-07
10
4.91E-07
3.72E-07
3.65E-07
3.99E-07
4.21E-07
4.55E-07
4.39E-07
4.17E-07
4.31E-07
3.90E-07
4.04E-07
20
5.10E-07
3.85E-07
3.75E-07
4.10E-07
4.31E-07
4.79E-07
4.66E-07
4.40E-07
4.57E-07
4.12E-07
4.04E-07
30
5.25E-07
3.94E-07
3.82E-07
4.17E-07
4.40E-07
5.00E-07
4.87E-07
4.57E-07
4.78E-07
4.31E-07
4.04E-07
50
5.53E-07
4.11E-07
3.98E-07
4.33E-07
4.55E-07
5.31E-07
5.21E-07
4.90E-07
5.10E-07
4.59E-07
4.06E-07
60
5.49E-07
4.10E-07
3.97E-07
4.29E-07
4.52E-07
5.28E-07
5.14E-07
4.84E-07
5.05E-07
4.56E-07
4.06E-07
70
5.49E-07
4.10E-07
3.97E-07
4.29E-07
4.52E-07
5.28E-07
5.14E-07
4.84E-07
5.05E-07
4.56E-07
4.06E-07
3.86E-07
4.14E-08
4.99E-07
2.73E-07
4.10E-07
5.09E-08
5.49E-07
2.70E-07
4.22E-07
5.40E-08
5.70E-07
2.74E-07
4.32E-07
5.69E-08
5.88E-07
2.76E-07
4.50E-07
6.15E-08
6.19E-07
2.81E-07
4.47E-07
6.06E-08
6.13E-07
2.81E-07
4.47E-07
6.06E-08
6.13E-07
2.81E-07
3.83E-07
2.23E-08
4.44E-07
3.22E-07
-7.15E-07
PASS
7.15E-07
PASS
4.26E-07
2.44E-08
4.93E-07
3.60E-07
-7.65E-07
PASS
7.65E-07
PASS
4.51E-07
2.60E-08
5.22E-07
3.80E-07
-8.15E-07
PASS
8.15E-07
PASS
4.71E-07 5.02E-07 4.97E-07
2.70E-08 2.85E-08 2.82E-08
5.44E-07 5.81E-07 5.75E-07
3.97E-07 4.24E-07 4.20E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
4.97E-07
2.82E-08
5.75E-07
4.20E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
68
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.31. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
69
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.31. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.38E-07
3.47E-07
3.44E-07
3.81E-07
3.89E-07
4.26E-07
4.07E-07
3.64E-07
3.87E-07
3.56E-07
4.07E-07
10
4.81E-07
3.68E-07
3.62E-07
3.97E-07
4.07E-07
4.70E-07
4.55E-07
4.05E-07
4.35E-07
3.96E-07
4.09E-07
20
5.01E-07
3.80E-07
3.74E-07
4.07E-07
4.19E-07
4.95E-07
4.83E-07
4.30E-07
4.63E-07
4.18E-07
4.09E-07
30
5.17E-07
3.88E-07
3.82E-07
4.15E-07
4.28E-07
5.14E-07
5.03E-07
4.49E-07
4.82E-07
4.38E-07
4.08E-07
50
5.45E-07
4.06E-07
3.99E-07
4.31E-07
4.42E-07
5.45E-07
5.37E-07
4.80E-07
5.17E-07
4.70E-07
4.10E-07
60
5.41E-07
4.04E-07
3.97E-07
4.26E-07
4.40E-07
5.40E-07
5.32E-07
4.76E-07
5.11E-07
4.65E-07
4.09E-07
70
5.41E-07
4.04E-07
3.97E-07
4.26E-07
4.40E-07
5.40E-07
5.32E-07
4.76E-07
5.11E-07
4.65E-07
4.09E-07
3.80E-07
3.84E-08
4.85E-07
2.75E-07
4.03E-07
4.77E-08
5.34E-07
2.72E-07
4.16E-07
5.11E-08
5.56E-07
2.76E-07
4.26E-07
5.43E-08
5.75E-07
2.77E-07
4.44E-07
5.91E-08
6.06E-07
2.82E-07
4.42E-07
5.82E-08
6.01E-07
2.82E-07
4.42E-07
5.82E-08
6.01E-07
2.82E-07
3.88E-07
2.92E-08
4.68E-07
3.08E-07
-7.15E-07
PASS
7.15E-07
PASS
4.32E-07
3.17E-08
5.19E-07
3.45E-07
-7.65E-07
PASS
7.65E-07
PASS
4.58E-07
3.30E-08
5.48E-07
3.67E-07
-8.15E-07
PASS
8.15E-07
PASS
4.77E-07 5.10E-07 5.05E-07
3.28E-08 3.36E-08 3.31E-08
5.67E-07 6.02E-07 5.96E-07
3.87E-07 4.18E-07 4.14E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
5.05E-07
3.31E-08
5.96E-07
4.14E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
70
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.32. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
71
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.32. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.98E-07
4.16E-07
3.87E-07
3.76E-07
4.15E-07
3.26E-07
3.90E-07
4.36E-07
3.87E-07
3.70E-07
3.57E-07
10
4.37E-07
4.36E-07
4.06E-07
3.94E-07
4.37E-07
3.59E-07
4.29E-07
4.83E-07
4.43E-07
4.13E-07
3.58E-07
20
4.58E-07
4.50E-07
4.17E-07
4.05E-07
4.48E-07
3.80E-07
4.53E-07
5.09E-07
4.69E-07
4.39E-07
3.59E-07
30
4.73E-07
4.61E-07
4.25E-07
4.14E-07
4.55E-07
3.97E-07
4.70E-07
5.30E-07
4.90E-07
4.58E-07
3.54E-07
50
4.99E-07
4.71E-07
4.41E-07
4.30E-07
4.73E-07
4.26E-07
5.03E-07
5.66E-07
5.22E-07
4.89E-07
3.62E-07
60
4.93E-07
4.70E-07
4.40E-07
4.29E-07
4.72E-07
4.23E-07
4.97E-07
5.61E-07
5.17E-07
4.87E-07
3.61E-07
70
4.93E-07
4.70E-07
4.40E-07
4.29E-07
4.72E-07
4.23E-07
4.97E-07
5.61E-07
5.17E-07
4.87E-07
3.61E-07
3.98E-07
1.71E-08
4.45E-07
3.51E-07
4.22E-07
2.08E-08
4.79E-07
3.65E-07
4.36E-07
2.30E-08
4.99E-07
3.73E-07
4.45E-07
2.51E-08
5.14E-07
3.77E-07
4.63E-07
2.76E-08
5.38E-07
3.87E-07
4.61E-07
2.59E-08
5.32E-07
3.90E-07
4.61E-07
2.59E-08
5.32E-07
3.90E-07
3.82E-07
3.96E-08
4.90E-07
2.73E-07
-7.15E-07
PASS
7.15E-07
PASS
4.25E-07
4.54E-08
5.50E-07
3.01E-07
-7.65E-07
PASS
7.65E-07
PASS
4.50E-07
4.71E-08
5.79E-07
3.21E-07
-8.15E-07
PASS
8.15E-07
PASS
4.69E-07 5.01E-07 4.97E-07
4.85E-08 5.09E-08 5.03E-08
6.02E-07 6.41E-07 6.35E-07
3.36E-07 3.62E-07 3.59E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
4.97E-07
5.03E-08
6.35E-07
3.59E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
72
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.33. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
73
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.33. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.94E-07
4.18E-07
3.96E-07
3.75E-07
4.07E-07
3.37E-07
3.86E-07
4.41E-07
3.92E-07
3.66E-07
3.55E-07
10
4.33E-07
4.38E-07
4.11E-07
3.97E-07
4.28E-07
3.70E-07
4.27E-07
4.89E-07
4.41E-07
4.10E-07
3.58E-07
20
4.52E-07
4.52E-07
4.24E-07
4.07E-07
4.41E-07
3.92E-07
4.50E-07
5.17E-07
4.68E-07
4.35E-07
3.57E-07
30
4.68E-07
4.60E-07
4.32E-07
4.17E-07
4.50E-07
4.10E-07
4.68E-07
5.35E-07
4.86E-07
4.55E-07
3.57E-07
50
4.93E-07
4.77E-07
4.50E-07
4.32E-07
4.67E-07
4.37E-07
5.00E-07
5.72E-07
5.21E-07
4.91E-07
3.59E-07
60
4.88E-07
4.77E-07
4.47E-07
4.32E-07
4.65E-07
4.33E-07
4.96E-07
5.69E-07
5.16E-07
4.84E-07
3.59E-07
70
4.88E-07
4.77E-07
4.47E-07
4.32E-07
4.65E-07
4.33E-07
4.96E-07
5.69E-07
5.16E-07
4.84E-07
3.59E-07
3.98E-07
1.59E-08
4.42E-07
3.54E-07
4.22E-07
1.69E-08
4.68E-07
3.75E-07
4.35E-07
1.96E-08
4.89E-07
3.82E-07
4.45E-07
2.08E-08
5.02E-07
3.88E-07
4.64E-07
2.35E-08
5.29E-07
3.99E-07
4.62E-07
2.27E-08
5.24E-07
4.00E-07
4.62E-07
2.27E-08
5.24E-07
4.00E-07
3.84E-07
3.85E-08
4.90E-07
2.79E-07
-7.15E-07
PASS
7.15E-07
PASS
4.27E-07
4.36E-08
5.47E-07
3.08E-07
-7.65E-07
PASS
7.65E-07
PASS
4.52E-07
4.58E-08
5.78E-07
3.27E-07
-8.15E-07
PASS
8.15E-07
PASS
4.71E-07 5.05E-07 4.99E-07
4.56E-08 4.90E-08 4.93E-08
5.96E-07 6.39E-07 6.35E-07
3.46E-07 3.70E-07 3.64E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
4.99E-07
4.93E-08
6.35E-07
3.64E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
74
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
Total Dose (krad(Si))
Figure 5.34. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
75
168-hr
70
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.34. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.35E-07
3.49E-07
3.48E-07
3.87E-07
3.94E-07
4.14E-07
3.87E-07
3.59E-07
3.79E-07
3.56E-07
4.04E-07
10
4.75E-07
3.70E-07
3.66E-07
4.03E-07
4.11E-07
4.60E-07
4.35E-07
4.01E-07
4.28E-07
3.94E-07
4.06E-07
20
4.96E-07
3.82E-07
3.77E-07
4.15E-07
4.22E-07
4.83E-07
4.62E-07
4.27E-07
4.53E-07
4.16E-07
4.05E-07
30
5.12E-07
3.92E-07
3.85E-07
4.22E-07
4.30E-07
5.05E-07
4.83E-07
4.44E-07
4.74E-07
4.33E-07
4.05E-07
50
5.40E-07
4.10E-07
4.00E-07
4.38E-07
4.43E-07
5.38E-07
5.18E-07
4.76E-07
5.05E-07
4.66E-07
4.07E-07
60
5.35E-07
4.08E-07
3.99E-07
4.34E-07
4.42E-07
5.32E-07
5.13E-07
4.71E-07
5.01E-07
4.61E-07
4.08E-07
70
5.35E-07
4.08E-07
3.99E-07
4.34E-07
4.42E-07
5.32E-07
5.13E-07
4.71E-07
5.01E-07
4.61E-07
4.08E-07
3.82E-07
3.61E-08
4.81E-07
2.83E-07
4.05E-07
4.40E-08
5.26E-07
2.84E-07
4.18E-07
4.79E-08
5.50E-07
2.87E-07
4.28E-07
5.07E-08
5.67E-07
2.89E-07
4.46E-07
5.53E-08
5.98E-07
2.95E-07
4.44E-07
5.41E-08
5.92E-07
2.95E-07
4.44E-07
5.41E-08
5.92E-07
2.95E-07
3.79E-07
2.36E-08
4.44E-07
3.14E-07
-7.15E-07
PASS
7.15E-07
PASS
4.24E-07
2.67E-08
4.97E-07
3.51E-07
-7.65E-07
PASS
7.65E-07
PASS
4.48E-07
2.70E-08
5.22E-07
3.74E-07
-8.15E-07
PASS
8.15E-07
PASS
4.68E-07 5.00E-07 4.96E-07
2.92E-08 2.96E-08 2.91E-08
5.48E-07 5.82E-07 5.75E-07
3.88E-07 4.19E-07 4.16E-07
-8.15E-07 -8.65E-07 -8.65E-07
PASS
PASS
PASS
8.15E-07 8.65E-07 8.65E-07
PASS
PASS
PASS
4.96E-07
2.91E-08
5.75E-07
4.16E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
76
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.35. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
77
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.35. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.11E-04
1.56E-05
-2.68E-04
7.05E-05
-1.97E-04
-1.22E-04
-3.35E-04
7.14E-05
-3.50E-05
-5.33E-05
-3.25E-04
10
-3.16E-04
-3.95E-06
-2.88E-04
5.77E-05
-2.20E-04
-1.34E-04
-3.43E-04
5.51E-05
-4.70E-05
-6.33E-05
-3.29E-04
20
-3.01E-04
-1.01E-05
-2.85E-04
6.78E-05
-2.14E-04
-1.34E-04
-3.46E-04
5.38E-05
-4.63E-05
-6.40E-05
-3.30E-04
30
-2.95E-04
-1.53E-05
-2.86E-04
6.86E-05
-2.07E-04
-1.36E-04
-3.49E-04
5.33E-05
-4.62E-05
-6.08E-05
-3.28E-04
50
-2.92E-04
-2.09E-05
-2.91E-04
7.20E-05
-2.03E-04
-1.36E-04
-3.47E-04
5.37E-05
-4.71E-05
-6.14E-05
-3.29E-04
60
-2.93E-04
-1.86E-05
-2.93E-04
8.13E-05
-2.02E-04
-1.34E-04
-3.46E-04
5.56E-05
-5.18E-05
-6.10E-05
-3.32E-04
70
-2.93E-04
-1.86E-05
-2.93E-04
8.13E-05
-2.02E-04
-1.34E-04
-3.46E-04
5.56E-05
-5.18E-05
-6.10E-05
-3.32E-04
-1.38E-04
1.71E-04
3.32E-04
-6.08E-04
-1.54E-04
1.70E-04
3.13E-04
-6.21E-04
-1.48E-04
1.67E-04
3.10E-04
-6.07E-04
-1.47E-04
1.65E-04
3.05E-04
-5.98E-04
-1.47E-04
1.65E-04
3.05E-04
-5.99E-04
-1.45E-04
1.69E-04
3.18E-04
-6.09E-04
-1.45E-04
1.69E-04
3.18E-04
-6.09E-04
-9.49E-05
1.51E-04
3.20E-04
-5.10E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.06E-04
1.49E-04
3.01E-04
-5.14E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.07E-04
1.49E-04
3.02E-04
-5.17E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.08E-04
1.51E-04
3.06E-04
-5.22E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.08E-04
1.50E-04
3.04E-04
-5.19E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.07E-04
1.50E-04
3.03E-04
-5.17E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.07E-04
1.50E-04
3.03E-04
-5.17E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
78
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.36. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
79
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.36. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.64E-04
-1.28E-06
1.16E-04
-1.90E-04
7.49E-05
-2.32E-04
2.43E-05
-1.50E-04
-2.51E-04
-1.67E-04
-2.56E-04
10
2.25E-04
-2.09E-05
1.03E-04
-2.00E-04
4.87E-05
-2.43E-04
2.03E-05
-1.59E-04
-2.49E-04
-1.78E-04
-2.56E-04
20
2.41E-04
-1.18E-05
1.09E-04
-1.89E-04
4.70E-05
-2.38E-04
1.95E-05
-1.58E-04
-2.47E-04
-1.78E-04
-2.56E-04
30
2.45E-04
-7.58E-06
1.12E-04
-1.84E-04
5.52E-05
-2.39E-04
2.41E-05
-1.57E-04
-2.46E-04
-1.79E-04
-2.56E-04
50
2.39E-04
-9.26E-06
1.13E-04
-1.84E-04
4.53E-05
-2.46E-04
2.06E-05
-1.61E-04
-2.53E-04
-1.80E-04
-2.57E-04
60
2.51E-04
-5.29E-06
1.16E-04
-1.75E-04
5.88E-05
-2.40E-04
2.55E-05
-1.58E-04
-2.51E-04
-1.79E-04
-2.57E-04
70
2.51E-04
-5.29E-06
1.16E-04
-1.75E-04
5.88E-05
-2.40E-04
2.55E-05
-1.58E-04
-2.51E-04
-1.79E-04
-2.57E-04
5.29E-05
1.67E-04
5.10E-04
-4.04E-04
3.13E-05
1.58E-04
4.64E-04
-4.01E-04
3.92E-05
1.58E-04
4.73E-04
-3.95E-04
4.40E-05
1.58E-04
4.77E-04
-3.89E-04
4.09E-05
1.56E-04
4.69E-04
-3.87E-04
4.91E-05
1.57E-04
4.79E-04
-3.81E-04
4.91E-05
1.57E-04
4.79E-04
-3.81E-04
-1.55E-04
1.09E-04
1.43E-04
-4.54E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.62E-04
1.09E-04
1.37E-04
-4.61E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.60E-04
1.07E-04
1.34E-04
-4.55E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.59E-04
1.09E-04
1.41E-04
-4.59E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.64E-04
1.11E-04
1.40E-04
-4.67E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.61E-04
1.11E-04
1.44E-04
-4.65E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.61E-04
1.11E-04
1.44E-04
-4.65E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.37. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
81
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.37. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.34E-04
-3.28E-04
-1.66E-04
-1.07E-04
-9.12E-05
-6.84E-05
6.27E-05
-3.56E-04
-3.55E-04
-4.91E-05
-2.70E-04
10
-1.74E-04
-3.59E-04
-1.78E-04
-1.50E-04
-1.16E-04
-8.21E-05
5.35E-05
-3.65E-04
-3.65E-04
-5.79E-05
-2.70E-04
20
-1.74E-04
-3.60E-04
-1.67E-04
-1.46E-04
-1.12E-04
-8.55E-05
5.02E-05
-3.64E-04
-3.64E-04
-5.53E-05
-2.70E-04
30
-1.77E-04
-3.61E-04
-1.61E-04
-1.45E-04
-1.04E-04
-8.55E-05
5.13E-05
-3.64E-04
-3.64E-04
-5.73E-05
-2.70E-04
50
-1.86E-04
-3.71E-04
-1.54E-04
-1.52E-04
-1.10E-04
-8.74E-05
5.15E-05
-3.61E-04
-3.62E-04
-5.43E-05
-2.70E-04
60
-1.81E-04
-3.67E-04
-1.47E-04
-1.49E-04
-1.05E-04
-8.56E-05
5.28E-05
-3.62E-04
-3.61E-04
-5.44E-05
-2.72E-04
70
-1.81E-04
-3.67E-04
-1.47E-04
-1.49E-04
-1.05E-04
-8.56E-05
5.28E-05
-3.62E-04
-3.61E-04
-5.44E-05
-2.72E-04
-1.65E-04
9.55E-05
9.67E-05
-4.27E-04
-1.95E-04
9.47E-05
6.43E-05
-4.55E-04
-1.92E-04
9.71E-05
7.45E-05
-4.58E-04
-1.89E-04
9.96E-05
8.37E-05
-4.62E-04
-1.95E-04
1.02E-04
8.51E-05
-4.74E-04
-1.90E-04
1.03E-04
9.15E-05
-4.71E-04
-1.90E-04
1.03E-04
9.15E-05
-4.71E-04
-1.53E-04
1.91E-04
3.71E-04
-6.78E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.63E-04
1.91E-04
3.61E-04
-6.87E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.64E-04
1.90E-04
3.56E-04
-6.84E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.64E-04
1.90E-04
3.56E-04
-6.84E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.63E-04
1.89E-04
3.55E-04
-6.80E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.62E-04
1.89E-04
3.57E-04
-6.81E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.62E-04
1.89E-04
3.57E-04
-6.81E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
82
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.38. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
83
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.38. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.50E-07
1.35E-04
-4.13E-04
4.01E-05
-1.41E-04
-1.41E-04
-3.81E-04
-2.73E-04
4.93E-05
-1.84E-04
-7.15E-05
10
-3.28E-05
1.22E-04
-4.35E-04
1.78E-05
-1.63E-04
-1.49E-04
-3.84E-04
-2.85E-04
3.77E-05
-1.90E-04
-7.69E-05
20
-2.35E-05
1.23E-04
-4.26E-04
2.40E-05
-1.55E-04
-1.48E-04
-3.80E-04
-2.86E-04
3.71E-05
-1.92E-04
-7.71E-05
30
-1.59E-05
1.25E-04
-4.24E-04
2.79E-05
-1.49E-04
-1.51E-04
-3.82E-04
-2.85E-04
3.74E-05
-1.94E-04
-7.66E-05
50
-1.19E-05
1.21E-04
-4.26E-04
2.88E-05
-1.47E-04
-1.53E-04
-3.84E-04
-2.87E-04
3.63E-05
-1.93E-04
-7.74E-05
60
-4.68E-06
1.31E-04
-4.30E-04
3.10E-05
-1.45E-04
-1.50E-04
-3.83E-04
-2.83E-04
3.98E-05
-1.93E-04
-7.91E-05
70
-4.68E-06
1.31E-04
-4.30E-04
3.10E-05
-1.45E-04
-1.50E-04
-3.83E-04
-2.83E-04
3.98E-05
-1.93E-04
-7.91E-05
-7.57E-05
2.13E-04
5.09E-04
-6.60E-04
-9.83E-05
2.15E-04
4.90E-04
-6.87E-04
-9.14E-05
2.12E-04
4.90E-04
-6.72E-04
-8.72E-05
2.13E-04
4.96E-04
-6.70E-04
-8.71E-05
2.13E-04
4.96E-04
-6.70E-04
-8.35E-05
2.17E-04
5.12E-04
-6.79E-04
-8.35E-05
2.17E-04
5.12E-04
-6.79E-04
-1.86E-04
1.60E-04
2.54E-04
-6.26E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.94E-04
1.58E-04
2.40E-04
-6.28E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.94E-04
1.57E-04
2.37E-04
-6.24E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.95E-04
1.57E-04
2.37E-04
-6.27E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.96E-04
1.58E-04
2.36E-04
-6.28E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.94E-04
1.58E-04
2.40E-04
-6.28E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.94E-04
1.58E-04
2.40E-04
-6.28E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
84
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.39. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
85
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.39. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= -15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.88E-10
6.09E-09
-8.06E-10
4.51E-09
-5.61E-10
-3.30E-09
5.21E-10
-5.57E-10
-3.33E-09
-2.20E-09
-9.38E-10
10
1.36E-10
5.67E-09
-1.44E-09
4.34E-09
-9.03E-10
-3.31E-09
2.60E-10
-1.02E-09
-2.82E-09
-2.39E-09
-8.65E-10
20
8.60E-11
5.69E-09
-1.53E-09
4.04E-09
-8.52E-10
-3.29E-09
6.00E-12
-1.30E-09
-2.80E-09
-2.46E-09
-9.19E-10
30
1.52E-10
5.01E-09
-1.21E-09
3.91E-09
-9.78E-10
-3.24E-09
-4.22E-10
-1.01E-09
-2.95E-09
-2.58E-09
-9.36E-10
50
7.29E-10
4.78E-09
-1.75E-09
3.76E-09
-8.76E-10
-3.53E-09
2.95E-10
-4.36E-10
-2.92E-09
-3.01E-09
-8.73E-10
60
6.34E-10
4.65E-09
-1.70E-09
3.76E-09
-1.05E-09
-3.48E-09
-3.00E-11
-4.23E-10
-2.72E-09
-2.92E-09
-9.53E-10
70
6.34E-10
4.65E-09
-1.70E-09
3.76E-09
-1.05E-09
-3.48E-09
-3.00E-11
-4.23E-10
-2.72E-09
-2.92E-09
-9.53E-10
1.92E-09
3.16E-09
1.06E-08
-6.75E-09
1.56E-09
3.23E-09
1.04E-08
-7.30E-09
1.49E-09
3.19E-09
1.02E-08
-7.26E-09
1.38E-09
2.89E-09
9.29E-09
-6.54E-09
1.33E-09
2.85E-09
9.15E-09
-6.49E-09
1.26E-09
2.84E-09
9.04E-09
-6.53E-09
1.26E-09
2.84E-09
9.04E-09
-6.53E-09
-1.77E-09
1.71E-09
2.91E-09
-6.45E-09
-7.00E-08
PASS
7.00E-08
PASS
-1.85E-09
1.46E-09
2.14E-09
-5.85E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.97E-09
1.32E-09
1.66E-09
-5.60E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.04E-09
1.25E-09
1.38E-09
-5.46E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.92E-09
1.72E-09
2.81E-09
-6.65E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.91E-09
1.57E-09
2.40E-09
-6.22E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.91E-09
1.57E-09
2.40E-09
-6.22E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
86
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.40. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
87
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.40. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= -15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-7.86E-09
-4.40E-11
1.11E-09
3.27E-09
9.10E-10
-8.18E-10
1.93E-09
3.62E-09
-2.12E-09
2.76E-10
-5.27E-09
10
-8.88E-09
-1.79E-10
6.56E-10
3.28E-09
2.52E-10
-7.29E-10
1.64E-09
3.34E-09
-1.72E-09
4.06E-10
-5.27E-09
20
-8.58E-09
-2.60E-11
5.83E-10
2.90E-09
4.39E-10
-2.66E-10
1.66E-09
3.67E-09
-2.35E-09
4.10E-10
-5.22E-09
30
-8.33E-09
-7.60E-11
5.39E-10
3.00E-09
9.95E-10
-3.53E-10
1.49E-09
3.65E-09
-2.01E-09
1.34E-10
-5.30E-09
50
-8.99E-09
-3.73E-10
4.20E-11
2.62E-09
7.79E-10
-1.26E-09
4.37E-10
3.29E-09
-2.02E-09
3.49E-10
-5.25E-09
60
-8.28E-09
-1.48E-10
-6.30E-11
2.50E-09
9.51E-10
-8.79E-10
1.07E-09
3.56E-09
-1.73E-09
5.55E-10
-5.26E-09
70
-8.28E-09
-1.48E-10
-6.30E-11
2.50E-09
9.51E-10
-8.79E-10
1.07E-09
3.56E-09
-1.73E-09
5.55E-10
-5.26E-09
-5.23E-10
4.28E-09
1.12E-08
-1.22E-08
-9.74E-10
4.62E-09
1.17E-08
-1.36E-08
-9.36E-10
4.42E-09
1.12E-08
-1.31E-08
-7.75E-10
4.38E-09
1.12E-08
-1.28E-08
-1.19E-09
4.51E-09
1.12E-08
-1.36E-08
-1.01E-09
4.20E-09
1.05E-08
-1.25E-08
-1.01E-09
4.20E-09
1.05E-08
-1.25E-08
5.77E-10
2.26E-09
6.77E-09
-5.61E-09
-7.00E-08
PASS
7.00E-08
PASS
5.87E-10
1.99E-09
6.03E-09
-4.86E-09
-1.00E-07
PASS
1.00E-07
PASS
6.23E-10
2.24E-09
6.76E-09
-5.51E-09
-1.00E-07
PASS
1.00E-07
PASS
5.81E-10
2.12E-09
6.40E-09
-5.23E-09
-1.00E-07
PASS
1.00E-07
PASS
1.58E-10
2.04E-09
5.75E-09
-5.43E-09
-1.00E-07
PASS
1.00E-07
PASS
5.15E-10
2.03E-09
6.09E-09
-5.06E-09
-1.00E-07
PASS
1.00E-07
PASS
5.15E-10
2.03E-09
6.09E-09
-5.06E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
88
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.41. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
89
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.41. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= -15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.05E-09
-1.81E-09
4.40E-09
-1.74E-09
-2.98E-09
-4.15E-09
-2.26E-09
7.09E-10
-1.15E-10
2.95E-09
1.98E-09
10
-1.45E-09
-1.95E-09
4.48E-09
-2.50E-09
-2.83E-09
-4.40E-09
-2.39E-09
7.29E-10
-4.88E-10
2.70E-09
1.92E-09
20
-1.78E-09
-1.95E-09
4.49E-09
-2.52E-09
-2.52E-09
-4.40E-09
-2.43E-09
4.24E-10
-3.20E-11
2.65E-09
1.95E-09
30
-1.61E-09
-1.62E-09
4.48E-09
-2.58E-09
-2.52E-09
-4.19E-09
-2.22E-09
1.29E-09
1.19E-10
3.11E-09
1.99E-09
50
-1.67E-09
-2.13E-09
4.27E-09
-2.85E-09
-2.62E-09
-3.81E-09
-2.60E-09
1.41E-09
7.09E-10
2.90E-09
1.93E-09
60
-1.52E-09
-1.98E-09
4.42E-09
-2.79E-09
-2.55E-09
-3.33E-09
-1.89E-09
1.28E-09
5.33E-10
2.57E-09
1.95E-09
70
-1.52E-09
-1.98E-09
4.42E-09
-2.79E-09
-2.55E-09
-3.33E-09
-1.89E-09
1.28E-09
5.33E-10
2.57E-09
1.95E-09
-6.36E-10
2.90E-09
7.31E-09
-8.59E-09
-8.49E-10
3.03E-09
7.45E-09
-9.15E-09
-8.58E-10
3.01E-09
7.39E-09
-9.10E-09
-7.70E-10
2.97E-09
7.38E-09
-8.92E-09
-1.00E-09
2.98E-09
7.17E-09
-9.17E-09
-8.82E-10
3.01E-09
7.36E-09
-9.13E-09
-8.82E-10
3.01E-09
7.36E-09
-9.13E-09
-5.73E-10
2.74E-09
6.93E-09
-8.08E-09
-7.00E-08
PASS
7.00E-08
PASS
-7.71E-10
2.75E-09
6.76E-09
-8.30E-09
-1.00E-07
PASS
1.00E-07
PASS
-7.56E-10
2.72E-09
6.70E-09
-8.21E-09
-1.00E-07
PASS
1.00E-07
PASS
-3.77E-10
2.87E-09
7.51E-09
-8.26E-09
-1.00E-07
PASS
1.00E-07
PASS
-2.79E-10
2.82E-09
7.45E-09
-8.01E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.68E-10
2.40E-09
6.41E-09
-6.74E-09
-1.00E-07
PASS
1.00E-07
PASS
-1.68E-10
2.40E-09
6.41E-09
-6.74E-09
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
90
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-07
1.00E-07
5.00E-08
0.00E+00
-5.00E-08
-1.00E-07
-1.50E-07
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.42. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
91
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.42. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ +/- 15V, VCM= -15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.23E-09
2.87E-09
-4.52E-09
-1.32E-09
-1.27E-09
-2.23E-09
8.51E-10
-1.11E-08
-4.01E-09
-4.66E-09
-4.54E-10
10
-1.69E-09
3.50E-09
-4.42E-09
-9.95E-10
-1.21E-09
-2.69E-09
9.44E-10
-1.16E-08
-4.05E-09
-4.18E-09
-3.95E-10
20
-1.73E-09
3.22E-09
-4.66E-09
-1.01E-09
-1.56E-09
-2.42E-09
2.77E-10
-1.18E-08
-4.13E-09
-4.06E-09
-4.98E-10
30
-1.70E-09
3.49E-09
-4.65E-09
-1.04E-09
-1.33E-09
-2.40E-09
8.79E-10
-1.17E-08
-3.22E-09
-4.85E-09
-4.54E-10
50
-1.72E-09
3.54E-09
-4.25E-09
-3.39E-10
-1.99E-09
-2.50E-09
1.39E-09
-1.10E-08
-3.21E-09
-4.30E-09
-5.41E-10
60
-1.79E-09
3.34E-09
-4.28E-09
-2.70E-10
-1.90E-09
-2.37E-09
9.01E-10
-1.06E-08
-3.42E-09
-4.11E-09
-5.03E-10
70
-1.79E-09
3.34E-09
-4.28E-09
-2.70E-10
-1.90E-09
-2.37E-09
9.01E-10
-1.06E-08
-3.42E-09
-4.11E-09
-5.03E-10
-1.09E-09
2.63E-09
6.11E-09
-8.30E-09
-9.62E-10
2.85E-09
6.84E-09
-8.77E-09
-1.15E-09
2.83E-09
6.60E-09
-8.90E-09
-1.05E-09
2.92E-09
6.96E-09
-9.05E-09
-9.53E-10
2.88E-09
6.94E-09
-8.85E-09
-9.79E-10
2.81E-09
6.72E-09
-8.67E-09
-9.79E-10
2.81E-09
6.72E-09
-8.67E-09
-4.24E-09
4.41E-09
7.85E-09
-1.63E-08
-7.00E-08
PASS
7.00E-08
PASS
-4.32E-09
4.57E-09
8.23E-09
-1.69E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.42E-09
4.49E-09
7.89E-09
-1.67E-08
-1.00E-07
PASS
1.00E-07
PASS
-4.27E-09
4.67E-09
8.55E-09
-1.71E-08
-1.00E-07
PASS
1.00E-07
PASS
-3.92E-09
4.50E-09
8.41E-09
-1.63E-08
-1.00E-07
PASS
1.00E-07
PASS
-3.92E-09
4.21E-09
7.62E-09
-1.55E-08
-1.00E-07
PASS
1.00E-07
PASS
-3.92E-09
4.21E-09
7.62E-09
-1.55E-08
-1.00E-07
PASS
1.00E-07
PASS
An ISO 9001:2000 Certified Company
92
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= -15 V #1
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.43. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
93
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.43. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.12E-07
-2.87E-07
-2.83E-07
-3.01E-07
-3.14E-07
-3.16E-07
-3.11E-07
-2.98E-07
-2.91E-07
-2.90E-07
-3.01E-07
10
-3.26E-07
-2.92E-07
-2.88E-07
-3.07E-07
-3.20E-07
-3.30E-07
-3.27E-07
-3.13E-07
-3.06E-07
-3.04E-07
-3.03E-07
20
-3.29E-07
-2.96E-07
-2.92E-07
-3.10E-07
-3.22E-07
-3.35E-07
-3.35E-07
-3.20E-07
-3.12E-07
-3.10E-07
-3.04E-07
30
-3.29E-07
-2.98E-07
-2.93E-07
-3.11E-07
-3.23E-07
-3.40E-07
-3.40E-07
-3.25E-07
-3.17E-07
-3.15E-07
-3.03E-07
50
-3.33E-07
-3.03E-07
-2.97E-07
-3.15E-07
-3.27E-07
-3.52E-07
-3.51E-07
-3.33E-07
-3.25E-07
-3.24E-07
-3.03E-07
60
-3.28E-07
-2.99E-07
-2.94E-07
-3.10E-07
-3.23E-07
-3.48E-07
-3.50E-07
-3.30E-07
-3.23E-07
-3.21E-07
-3.04E-07
70
-3.28E-07
-2.99E-07
-2.94E-07
-3.10E-07
-3.23E-07
-3.48E-07
-3.50E-07
-3.30E-07
-3.23E-07
-3.21E-07
-3.04E-07
-2.99E-07
1.41E-08
-2.61E-07
-3.38E-07
-3.07E-07
1.63E-08
-2.62E-07
-3.51E-07
-3.10E-07
1.60E-08
-2.66E-07
-3.54E-07
-3.11E-07
1.57E-08
-2.68E-07
-3.54E-07
-3.15E-07
1.53E-08
-2.73E-07
-3.57E-07
-3.11E-07
1.46E-08
-2.70E-07
-3.51E-07
-3.11E-07
1.46E-08
-2.70E-07
-3.51E-07
-3.01E-07
1.18E-08
-2.69E-07
-3.34E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.16E-07
1.19E-08
-2.84E-07
-3.49E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.22E-07
1.19E-08
-2.90E-07
-3.55E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.27E-07
1.19E-08
-2.95E-07
-3.60E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.37E-07
1.37E-08
-2.99E-07
-3.75E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.34E-07
1.37E-08
-2.97E-07
-3.72E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.34E-07
1.37E-08
-2.97E-07
-3.72E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
94
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= -15 V #2
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.44. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
95
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.44. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.99E-07
-2.93E-07
-2.97E-07
-2.74E-07
-2.95E-07
-2.83E-07
-3.11E-07
-3.24E-07
-2.95E-07
-2.96E-07
-2.89E-07
10
-3.14E-07
-2.98E-07
-3.02E-07
-2.80E-07
-3.00E-07
-2.96E-07
-3.24E-07
-3.39E-07
-3.10E-07
-3.11E-07
-2.90E-07
20
-3.16E-07
-3.01E-07
-3.05E-07
-2.82E-07
-3.03E-07
-3.02E-07
-3.30E-07
-3.49E-07
-3.16E-07
-3.17E-07
-2.91E-07
30
-3.16E-07
-3.02E-07
-3.06E-07
-2.82E-07
-3.03E-07
-3.06E-07
-3.33E-07
-3.54E-07
-3.21E-07
-3.22E-07
-2.91E-07
50
-3.21E-07
-3.06E-07
-3.11E-07
-2.85E-07
-3.07E-07
-3.15E-07
-3.41E-07
-3.63E-07
-3.29E-07
-3.31E-07
-2.90E-07
60
-3.14E-07
-3.02E-07
-3.07E-07
-2.82E-07
-3.03E-07
-3.12E-07
-3.38E-07
-3.60E-07
-3.26E-07
-3.29E-07
-2.91E-07
70
-3.14E-07
-3.02E-07
-3.07E-07
-2.82E-07
-3.03E-07
-3.12E-07
-3.38E-07
-3.60E-07
-3.26E-07
-3.29E-07
-2.91E-07
-2.92E-07
1.01E-08
-2.64E-07
-3.19E-07
-2.99E-07
1.22E-08
-2.65E-07
-3.32E-07
-3.01E-07
1.25E-08
-2.67E-07
-3.36E-07
-3.02E-07
1.23E-08
-2.68E-07
-3.35E-07
-3.06E-07
1.29E-08
-2.71E-07
-3.41E-07
-3.02E-07
1.21E-08
-2.68E-07
-3.35E-07
-3.02E-07
1.21E-08
-2.68E-07
-3.35E-07
-3.02E-07
1.58E-08
-2.58E-07
-3.45E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.16E-07
1.62E-08
-2.72E-07
-3.61E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.23E-07
1.77E-08
-2.74E-07
-3.71E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.27E-07
1.79E-08
-2.78E-07
-3.76E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.36E-07
1.78E-08
-2.87E-07
-3.85E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.33E-07
1.78E-08
-2.84E-07
-3.82E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.33E-07
1.78E-08
-2.84E-07
-3.82E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
96
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= -15 V #3
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.45. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
97
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.45. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.86E-07
-2.94E-07
-2.99E-07
-2.79E-07
-2.94E-07
-2.86E-07
-3.13E-07
-3.27E-07
-2.94E-07
-2.95E-07
-2.86E-07
10
-3.00E-07
-2.99E-07
-3.03E-07
-2.85E-07
-2.99E-07
-3.00E-07
-3.26E-07
-3.47E-07
-3.09E-07
-3.10E-07
-2.88E-07
20
-3.03E-07
-3.03E-07
-3.07E-07
-2.88E-07
-3.02E-07
-3.05E-07
-3.32E-07
-3.53E-07
-3.16E-07
-3.17E-07
-2.88E-07
30
-3.03E-07
-3.04E-07
-3.08E-07
-2.88E-07
-3.02E-07
-3.10E-07
-3.36E-07
-3.58E-07
-3.20E-07
-3.22E-07
-2.88E-07
50
-3.07E-07
-3.09E-07
-3.12E-07
-2.91E-07
-3.06E-07
-3.18E-07
-3.46E-07
-3.65E-07
-3.28E-07
-3.31E-07
-2.87E-07
60
-3.02E-07
-3.05E-07
-3.08E-07
-2.87E-07
-3.02E-07
-3.15E-07
-3.40E-07
-3.64E-07
-3.26E-07
-3.29E-07
-2.88E-07
70
-3.02E-07
-3.05E-07
-3.08E-07
-2.87E-07
-3.02E-07
-3.15E-07
-3.40E-07
-3.64E-07
-3.26E-07
-3.29E-07
-2.88E-07
-2.90E-07
7.68E-09
-2.69E-07
-3.11E-07
-2.97E-07
7.13E-09
-2.78E-07
-3.17E-07
-3.00E-07
7.34E-09
-2.80E-07
-3.20E-07
-3.01E-07
7.44E-09
-2.81E-07
-3.21E-07
-3.05E-07
8.31E-09
-2.82E-07
-3.28E-07
-3.01E-07
8.14E-09
-2.79E-07
-3.23E-07
-3.01E-07
8.14E-09
-2.79E-07
-3.23E-07
-3.03E-07
1.64E-08
-2.58E-07
-3.48E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.18E-07
1.84E-08
-2.68E-07
-3.69E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.24E-07
1.84E-08
-2.74E-07
-3.75E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.29E-07
1.84E-08
-2.79E-07
-3.80E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.38E-07
1.84E-08
-2.87E-07
-3.88E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.35E-07
1.85E-08
-2.84E-07
-3.86E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.35E-07
1.85E-08
-2.84E-07
-3.86E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
98
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ +/- 15V, VCM= -15 V #4
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.46. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
99
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.46. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.20E-07
-2.83E-07
-2.85E-07
-2.98E-07
-3.13E-07
-3.12E-07
-3.17E-07
-3.06E-07
-2.88E-07
-2.89E-07
-2.99E-07
10
-3.34E-07
-2.88E-07
-2.90E-07
-3.04E-07
-3.18E-07
-3.25E-07
-3.32E-07
-3.21E-07
-3.02E-07
-3.03E-07
-3.01E-07
20
-3.37E-07
-2.92E-07
-2.93E-07
-3.06E-07
-3.21E-07
-3.31E-07
-3.39E-07
-3.27E-07
-3.09E-07
-3.09E-07
-3.01E-07
30
-3.37E-07
-2.93E-07
-2.94E-07
-3.07E-07
-3.21E-07
-3.35E-07
-3.47E-07
-3.32E-07
-3.13E-07
-3.14E-07
-3.01E-07
50
-3.42E-07
-2.98E-07
-2.99E-07
-3.10E-07
-3.25E-07
-3.45E-07
-3.54E-07
-3.40E-07
-3.21E-07
-3.22E-07
-3.00E-07
60
-3.37E-07
-2.94E-07
-2.95E-07
-3.06E-07
-3.21E-07
-3.40E-07
-3.53E-07
-3.37E-07
-3.19E-07
-3.20E-07
-3.01E-07
70
-3.37E-07
-2.94E-07
-2.95E-07
-3.06E-07
-3.21E-07
-3.40E-07
-3.53E-07
-3.37E-07
-3.19E-07
-3.20E-07
-3.01E-07
-3.00E-07
1.64E-08
-2.55E-07
-3.45E-07
-3.07E-07
1.94E-08
-2.54E-07
-3.60E-07
-3.10E-07
1.91E-08
-2.57E-07
-3.62E-07
-3.11E-07
1.88E-08
-2.59E-07
-3.62E-07
-3.15E-07
1.89E-08
-2.63E-07
-3.67E-07
-3.10E-07
1.82E-08
-2.61E-07
-3.60E-07
-3.10E-07
1.82E-08
-2.61E-07
-3.60E-07
-3.02E-07
1.32E-08
-2.66E-07
-3.39E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.17E-07
1.34E-08
-2.80E-07
-3.54E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.23E-07
1.35E-08
-2.86E-07
-3.60E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.28E-07
1.43E-08
-2.89E-07
-3.68E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.37E-07
1.44E-08
-2.97E-07
-3.76E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.34E-07
1.43E-08
-2.95E-07
-3.73E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.34E-07
1.43E-08
-2.95E-07
-3.73E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
100
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= -15 V #1
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.47. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
101
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.47. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.12E-07
-2.92E-07
-2.82E-07
-3.05E-07
-3.13E-07
-3.12E-07
-3.11E-07
-2.97E-07
-2.87E-07
-2.87E-07
-3.00E-07
10
-3.25E-07
-2.97E-07
-2.87E-07
-3.11E-07
-3.18E-07
-3.26E-07
-3.27E-07
-3.11E-07
-3.02E-07
-3.01E-07
-3.02E-07
20
-3.28E-07
-3.01E-07
-2.90E-07
-3.14E-07
-3.21E-07
-3.31E-07
-3.34E-07
-3.17E-07
-3.09E-07
-3.07E-07
-3.02E-07
30
-3.29E-07
-3.02E-07
-2.91E-07
-3.14E-07
-3.22E-07
-3.36E-07
-3.39E-07
-3.23E-07
-3.14E-07
-3.12E-07
-3.02E-07
50
-3.34E-07
-3.07E-07
-2.95E-07
-3.18E-07
-3.26E-07
-3.48E-07
-3.52E-07
-3.32E-07
-3.22E-07
-3.20E-07
-3.01E-07
60
-3.28E-07
-3.03E-07
-2.92E-07
-3.13E-07
-3.21E-07
-3.45E-07
-3.50E-07
-3.29E-07
-3.19E-07
-3.18E-07
-3.02E-07
70
-3.28E-07
-3.03E-07
-2.92E-07
-3.13E-07
-3.21E-07
-3.45E-07
-3.50E-07
-3.29E-07
-3.19E-07
-3.18E-07
-3.02E-07
-3.01E-07
1.35E-08
-2.64E-07
-3.38E-07
-3.08E-07
1.57E-08
-2.65E-07
-3.51E-07
-3.11E-07
1.54E-08
-2.69E-07
-3.53E-07
-3.12E-07
1.51E-08
-2.70E-07
-3.53E-07
-3.16E-07
1.51E-08
-2.75E-07
-3.58E-07
-3.12E-07
1.44E-08
-2.72E-07
-3.51E-07
-3.12E-07
1.44E-08
-2.72E-07
-3.51E-07
-2.99E-07
1.23E-08
-2.65E-07
-3.33E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.13E-07
1.23E-08
-2.80E-07
-3.47E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.20E-07
1.24E-08
-2.86E-07
-3.54E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.25E-07
1.23E-08
-2.91E-07
-3.58E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.35E-07
1.47E-08
-2.94E-07
-3.75E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.32E-07
1.47E-08
-2.92E-07
-3.73E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.32E-07
1.47E-08
-2.92E-07
-3.73E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
102
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= -15 V #2
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.48. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
103
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.48. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.91E-07
-2.93E-07
-2.98E-07
-2.77E-07
-2.95E-07
-2.82E-07
-3.12E-07
-3.27E-07
-2.92E-07
-2.96E-07
-2.83E-07
10
-3.04E-07
-2.97E-07
-3.02E-07
-2.83E-07
-3.00E-07
-2.95E-07
-3.25E-07
-3.49E-07
-3.08E-07
-3.11E-07
-2.85E-07
20
-3.07E-07
-3.01E-07
-3.05E-07
-2.84E-07
-3.03E-07
-3.01E-07
-3.31E-07
-3.56E-07
-3.13E-07
-3.18E-07
-2.85E-07
30
-3.07E-07
-3.02E-07
-3.06E-07
-2.85E-07
-3.04E-07
-3.05E-07
-3.34E-07
-3.60E-07
-3.19E-07
-3.22E-07
-2.84E-07
50
-3.11E-07
-3.06E-07
-3.11E-07
-2.88E-07
-3.07E-07
-3.13E-07
-3.41E-07
-3.67E-07
-3.27E-07
-3.31E-07
-2.84E-07
60
-3.06E-07
-3.02E-07
-3.07E-07
-2.84E-07
-3.04E-07
-3.11E-07
-3.38E-07
-3.65E-07
-3.25E-07
-3.29E-07
-2.85E-07
70
-3.06E-07
-3.02E-07
-3.07E-07
-2.84E-07
-3.04E-07
-3.11E-07
-3.38E-07
-3.65E-07
-3.25E-07
-3.29E-07
-2.85E-07
-2.91E-07
8.02E-09
-2.69E-07
-3.13E-07
-2.97E-07
8.55E-09
-2.74E-07
-3.21E-07
-3.00E-07
9.16E-09
-2.75E-07
-3.25E-07
-3.01E-07
9.07E-09
-2.76E-07
-3.26E-07
-3.05E-07
9.60E-09
-2.78E-07
-3.31E-07
-3.01E-07
9.27E-09
-2.75E-07
-3.26E-07
-3.01E-07
9.27E-09
-2.75E-07
-3.26E-07
-3.02E-07
1.77E-08
-2.53E-07
-3.50E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.18E-07
2.05E-08
-2.61E-07
-3.74E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.24E-07
2.08E-08
-2.67E-07
-3.81E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.28E-07
2.07E-08
-2.71E-07
-3.85E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.36E-07
2.02E-08
-2.80E-07
-3.91E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.33E-07
2.02E-08
-2.78E-07
-3.89E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.33E-07
2.02E-08
-2.78E-07
-3.89E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
104
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= -15 V #3
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.49. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
105
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.49. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.85E-07
-2.92E-07
-3.03E-07
-2.77E-07
-2.90E-07
-2.82E-07
-3.10E-07
-3.26E-07
-2.93E-07
-2.98E-07
-2.88E-07
10
-2.99E-07
-2.97E-07
-3.08E-07
-2.83E-07
-2.96E-07
-2.95E-07
-3.23E-07
-3.48E-07
-3.08E-07
-3.12E-07
-2.89E-07
20
-3.01E-07
-3.00E-07
-3.11E-07
-2.85E-07
-2.99E-07
-3.01E-07
-3.29E-07
-3.54E-07
-3.15E-07
-3.19E-07
-2.90E-07
30
-3.01E-07
-3.02E-07
-3.12E-07
-2.85E-07
-3.00E-07
-3.05E-07
-3.33E-07
-3.60E-07
-3.20E-07
-3.24E-07
-2.89E-07
50
-3.05E-07
-3.06E-07
-3.16E-07
-2.88E-07
-3.03E-07
-3.14E-07
-3.40E-07
-3.68E-07
-3.29E-07
-3.33E-07
-2.89E-07
60
-3.00E-07
-3.03E-07
-3.12E-07
-2.84E-07
-2.99E-07
-3.11E-07
-3.38E-07
-3.66E-07
-3.26E-07
-3.31E-07
-2.90E-07
70
-3.00E-07
-3.03E-07
-3.12E-07
-2.84E-07
-2.99E-07
-3.11E-07
-3.38E-07
-3.66E-07
-3.26E-07
-3.31E-07
-2.90E-07
-2.89E-07
9.40E-09
-2.64E-07
-3.15E-07
-2.96E-07
8.96E-09
-2.72E-07
-3.21E-07
-2.99E-07
9.41E-09
-2.73E-07
-3.25E-07
-3.00E-07
9.44E-09
-2.74E-07
-3.26E-07
-3.04E-07
1.04E-08
-2.75E-07
-3.32E-07
-3.00E-07
1.02E-08
-2.72E-07
-3.28E-07
-3.00E-07
1.02E-08
-2.72E-07
-3.28E-07
-3.02E-07
1.70E-08
-2.55E-07
-3.48E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.17E-07
2.01E-08
-2.62E-07
-3.72E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.24E-07
1.98E-08
-2.69E-07
-3.78E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.29E-07
2.03E-08
-2.73E-07
-3.84E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.37E-07
1.97E-08
-2.83E-07
-3.91E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.34E-07
2.01E-08
-2.79E-07
-3.90E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.34E-07
2.01E-08
-2.79E-07
-3.90E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
106
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ +/- 15V, VCM= -15 V #4
(A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.50. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
107
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.50. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.19E-07
-2.86E-07
-2.80E-07
-2.97E-07
-3.12E-07
-3.09E-07
-3.17E-07
-2.95E-07
-2.83E-07
-2.84E-07
-2.98E-07
10
-3.32E-07
-2.91E-07
-2.86E-07
-3.03E-07
-3.16E-07
-3.22E-07
-3.33E-07
-3.08E-07
-2.98E-07
-2.99E-07
-3.00E-07
20
-3.35E-07
-2.95E-07
-2.88E-07
-3.05E-07
-3.19E-07
-3.28E-07
-3.39E-07
-3.15E-07
-3.04E-07
-3.05E-07
-3.01E-07
30
-3.36E-07
-2.96E-07
-2.90E-07
-3.06E-07
-3.20E-07
-3.32E-07
-3.50E-07
-3.20E-07
-3.10E-07
-3.09E-07
-3.00E-07
50
-3.40E-07
-3.01E-07
-2.94E-07
-3.10E-07
-3.23E-07
-3.40E-07
-3.58E-07
-3.29E-07
-3.18E-07
-3.18E-07
-2.99E-07
60
-3.35E-07
-2.97E-07
-2.91E-07
-3.05E-07
-3.19E-07
-3.37E-07
-3.55E-07
-3.26E-07
-3.15E-07
-3.15E-07
-3.00E-07
70
-3.35E-07
-2.97E-07
-2.91E-07
-3.05E-07
-3.19E-07
-3.37E-07
-3.55E-07
-3.26E-07
-3.15E-07
-3.15E-07
-3.00E-07
-2.99E-07
1.64E-08
-2.54E-07
-3.44E-07
-3.06E-07
1.88E-08
-2.54E-07
-3.57E-07
-3.08E-07
1.88E-08
-2.57E-07
-3.60E-07
-3.09E-07
1.85E-08
-2.59E-07
-3.60E-07
-3.14E-07
1.82E-08
-2.64E-07
-3.64E-07
-3.09E-07
1.76E-08
-2.61E-07
-3.58E-07
-3.09E-07
1.76E-08
-2.61E-07
-3.58E-07
-2.98E-07
1.50E-08
-2.57E-07
-3.39E-07
-7.15E-07
PASS
7.15E-07
PASS
-3.12E-07
1.52E-08
-2.70E-07
-3.54E-07
-7.65E-07
PASS
7.65E-07
PASS
-3.18E-07
1.51E-08
-2.77E-07
-3.60E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.24E-07
1.72E-08
-2.77E-07
-3.71E-07
-8.15E-07
PASS
8.15E-07
PASS
-3.32E-07
1.72E-08
-2.85E-07
-3.80E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.30E-07
1.68E-08
-2.84E-07
-3.76E-07
-8.65E-07
PASS
8.65E-07
PASS
-3.30E-07
1.68E-08
-2.84E-07
-3.76E-07
-8.65E-07
PASS
8.65E-07
PASS
An ISO 9001:2000 Certified Company
108
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1
(V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E+03
5.00E+03
4.00E+03
3.00E+03
2.00E+03
1.00E+03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.51. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) versus total dose. The
data show some degradation with radiation, however it is not sufficient for any of the units-under-test to
exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
109
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.51. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
3.49E+03
3.78E+03
6.37E+03
3.68E+03
6.26E+03
6.28E+03
3.53E+03
6.03E+03
3.60E+03
6.13E+03
6.17E+03
10
3.42E+03
3.53E+03
6.06E+03
3.16E+03
6.13E+03
5.56E+03
3.36E+03
6.20E+03
3.53E+03
6.13E+03
6.19E+03
20
3.42E+03
3.57E+03
6.35E+03
3.35E+03
5.68E+03
5.34E+03
3.47E+03
5.36E+03
3.58E+03
6.19E+03
5.88E+03
30
3.35E+03
3.39E+03
6.11E+03
3.22E+03
5.56E+03
4.89E+03
3.47E+03
5.26E+03
3.33E+03
5.20E+03
6.13E+03
50
3.35E+03
3.45E+03
5.87E+03
3.11E+03
5.48E+03
6.18E+03
3.38E+03
5.10E+03
3.23E+03
5.34E+03
5.69E+03
60
3.22E+03
3.45E+03
6.06E+03
3.45E+03
5.60E+03
5.47E+03
3.38E+03
5.20E+03
3.38E+03
5.40E+03
5.75E+03
70
3.22E+03
3.45E+03
6.06E+03
3.45E+03
5.60E+03
5.47E+03
3.38E+03
5.20E+03
3.38E+03
5.40E+03
5.75E+03
4.71E+03
1.47E+03
8.73E+03
6.96E+02
4.46E+03
1.50E+03
8.58E+03
3.43E+02
4.47E+03
1.43E+03
8.39E+03
5.51E+02
4.33E+03
1.39E+03
8.15E+03
5.02E+02
4.25E+03
1.31E+03
7.85E+03
6.53E+02
4.35E+03
1.36E+03
8.08E+03
6.31E+02
4.35E+03
1.36E+03
8.08E+03
6.31E+02
5.11E+03
1.42E+03
9.00E+03
1.23E+03
1.00E+03
FAIL
4.96E+03
1.40E+03
8.79E+03
1.12E+03
5.00E+02
FAIL
4.78E+03
1.20E+03
8.08E+03
1.48E+03
5.00E+02
PASS
4.43E+03
9.54E+02
7.05E+03
1.82E+03
5.00E+02
PASS
4.65E+03
1.29E+03
8.19E+03
1.11E+03
5.00E+02
PASS
4.57E+03
1.09E+03
7.54E+03
1.59E+03
5.00E+02
PASS
4.57E+03
1.09E+03
7.54E+03
1.59E+03
5.00E+02
PASS
An ISO 9001:2000 Certified Company
110
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2
(V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E+03
5.00E+03
4.00E+03
3.00E+03
2.00E+03
1.00E+03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.52. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) versus total dose. The
data show some degradation with radiation, however it is not sufficient for any of the units-under-test to
exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
111
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.52. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
3.56E+03
3.73E+03
3.63E+03
4.87E+03
3.79E+03
4.82E+03
5.66E+03
5.92E+03
5.69E+03
4.13E+03
6.12E+03
10
3.49E+03
3.50E+03
3.41E+03
4.64E+03
3.42E+03
5.14E+03
5.67E+03
5.95E+03
5.39E+03
4.44E+03
5.47E+03
20
3.43E+03
3.54E+03
3.46E+03
4.42E+03
3.66E+03
4.76E+03
5.08E+03
6.01E+03
5.03E+03
3.88E+03
5.70E+03
30
3.24E+03
3.45E+03
3.36E+03
4.54E+03
3.40E+03
4.91E+03
5.17E+03
5.40E+03
5.32E+03
2.96E+03
4.55E+03
50
3.35E+03
3.47E+03
3.29E+03
4.28E+03
3.36E+03
4.21E+03
5.09E+03
4.99E+03
5.36E+03
4.69E+03
5.14E+03
60
3.28E+03
3.27E+03
3.23E+03
4.21E+03
3.48E+03
4.86E+03
4.79E+03
5.69E+03
5.38E+03
3.78E+03
5.38E+03
70
3.28E+03
3.27E+03
3.23E+03
4.21E+03
3.48E+03
4.86E+03
4.79E+03
5.69E+03
5.38E+03
3.78E+03
5.38E+03
3.92E+03
5.42E+02
5.40E+03
2.43E+03
3.69E+03
5.31E+02
5.15E+03
2.24E+03
3.70E+03
4.12E+02
4.83E+03
2.57E+03
3.60E+03
5.32E+02
5.05E+03
2.14E+03
3.55E+03
4.12E+02
4.68E+03
2.42E+03
3.49E+03
4.11E+02
4.62E+03
2.37E+03
3.49E+03
4.11E+02
4.62E+03
2.37E+03
5.24E+03
7.50E+02
7.30E+03
3.19E+03
1.00E+03
PASS
5.32E+03
5.78E+02
6.90E+03
3.73E+03
5.00E+02
PASS
4.95E+03
7.63E+02
7.04E+03
2.86E+03
5.00E+02
PASS
4.75E+03
1.02E+03
7.54E+03
1.96E+03
5.00E+02
PASS
4.87E+03
4.38E+02
6.07E+03
3.67E+03
5.00E+02
PASS
4.90E+03
7.27E+02
6.89E+03
2.91E+03
5.00E+02
PASS
4.90E+03
7.27E+02
6.89E+03
2.91E+03
5.00E+02
PASS
An ISO 9001:2000 Certified Company
112
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3
(V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E+03
5.00E+03
4.00E+03
3.00E+03
2.00E+03
1.00E+03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.53. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV) versus total dose. The
data show some degradation with radiation, however it is not sufficient for any of the units-under-test to
exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
113
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.53. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
6.36E+03
4.87E+03
3.60E+03
4.12E+03
5.89E+03
6.56E+03
4.79E+03
4.38E+03
3.71E+03
3.68E+03
3.50E+03
10
6.47E+03
4.49E+03
3.42E+03
3.77E+03
5.43E+03
6.42E+03
5.26E+03
4.35E+03
3.62E+03
3.82E+03
3.63E+03
20
6.32E+03
4.63E+03
3.16E+03
3.72E+03
5.24E+03
6.35E+03
4.80E+03
4.28E+03
3.43E+03
3.71E+03
3.54E+03
30
5.70E+03
4.68E+03
3.31E+03
3.59E+03
4.96E+03
6.15E+03
5.12E+03
3.91E+03
3.74E+03
3.47E+03
3.75E+03
50
6.20E+03
4.15E+03
3.35E+03
3.46E+03
4.97E+03
6.64E+03
4.36E+03
4.00E+03
3.57E+03
3.54E+03
3.54E+03
60
5.67E+03
4.44E+03
3.08E+03
3.53E+03
4.97E+03
6.00E+03
4.64E+03
4.05E+03
3.27E+03
3.53E+03
3.58E+03
70
5.67E+03
4.44E+03
3.08E+03
3.53E+03
4.97E+03
6.00E+03
4.64E+03
4.05E+03
3.27E+03
3.53E+03
3.58E+03
4.97E+03
1.16E+03
8.15E+03
1.78E+03
4.72E+03
1.25E+03
8.13E+03
1.30E+03
4.61E+03
1.25E+03
8.03E+03
1.20E+03
4.45E+03
9.90E+02
7.16E+03
1.73E+03
4.43E+03
1.18E+03
7.67E+03
1.18E+03
4.34E+03
1.05E+03
7.22E+03
1.45E+03
4.34E+03
1.05E+03
7.22E+03
1.45E+03
4.62E+03
1.18E+03
7.86E+03
1.39E+03
1.00E+03
PASS
4.69E+03
1.16E+03
7.86E+03
1.53E+03
5.00E+02
PASS
4.51E+03
1.16E+03
7.68E+03
1.34E+03
5.00E+02
PASS
4.48E+03
1.13E+03
7.57E+03
1.38E+03
5.00E+02
PASS
4.42E+03
1.29E+03
7.95E+03
8.98E+02
5.00E+02
PASS
4.30E+03
1.09E+03
7.28E+03
1.32E+03
5.00E+02
PASS
4.30E+03
1.09E+03
7.28E+03
1.32E+03
5.00E+02
PASS
An ISO 9001:2000 Certified Company
114
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4
(V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
5.00E+03
4.50E+03
4.00E+03
3.50E+03
3.00E+03
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.54. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV) versus total dose. The
data show some degradation with radiation, however it is not sufficient for any of the units-under-test to
exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated
under electrical bias while the shaded diamonds are the average of the measured data points for the units
irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points
after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid
and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
115
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.54. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.31E+03
3.75E+03
6.16E+03
5.58E+03
4.01E+03
3.90E+03
4.36E+03
4.65E+03
3.85E+03
3.79E+03
6.23E+03
10
4.36E+03
3.62E+03
5.94E+03
4.93E+03
3.84E+03
3.83E+03
4.10E+03
4.34E+03
3.62E+03
3.60E+03
5.84E+03
20
4.18E+03
3.48E+03
5.70E+03
5.15E+03
4.04E+03
3.79E+03
4.01E+03
4.47E+03
3.88E+03
3.80E+03
6.18E+03
30
4.37E+03
3.44E+03
6.10E+03
4.90E+03
3.82E+03
3.67E+03
3.96E+03
4.22E+03
3.90E+03
3.64E+03
5.97E+03
50
3.93E+03
3.61E+03
5.65E+03
4.91E+03
3.80E+03
3.73E+03
3.89E+03
4.23E+03
3.51E+03
3.49E+03
5.64E+03
60
4.04E+03
3.28E+03
5.65E+03
4.91E+03
3.73E+03
3.59E+03
4.18E+03
4.33E+03
3.81E+03
3.53E+03
6.07E+03
70
4.04E+03
3.28E+03
5.65E+03
4.91E+03
3.73E+03
3.59E+03
4.18E+03
4.33E+03
3.81E+03
3.53E+03
6.07E+03
4.76E+03
1.05E+03
7.65E+03
1.87E+03
4.54E+03
9.32E+02
7.10E+03
1.99E+03
4.51E+03
8.96E+02
6.96E+03
2.05E+03
4.52E+03
1.04E+03
7.37E+03
1.67E+03
4.38E+03
8.69E+02
6.76E+03
1.99E+03
4.32E+03
9.51E+02
6.93E+03
1.71E+03
4.32E+03
9.51E+02
6.93E+03
1.71E+03
4.11E+03
3.78E+02
5.15E+03
3.07E+03
1.00E+03
PASS
3.90E+03
3.19E+02
4.77E+03
3.02E+03
5.00E+02
PASS
3.99E+03
2.83E+02
4.77E+03
3.21E+03
5.00E+02
PASS
3.88E+03
2.34E+02
4.52E+03
3.24E+03
5.00E+02
PASS
3.77E+03
3.04E+02
4.60E+03
2.94E+03
5.00E+02
PASS
3.89E+03
3.55E+02
4.86E+03
2.91E+03
5.00E+02
PASS
3.89E+03
3.55E+02
4.86E+03
2.91E+03
5.00E+02
PASS
An ISO 9001:2000 Certified Company
116
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
-5.00E+02
-1.00E+03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.55. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
117
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.55. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.86E+02
9.44E+02
2.38E+03
8.76E+02
2.25E+03
2.12E+03
9.04E+02
2.18E+03
9.29E+02
2.14E+03
2.15E+03
10
8.73E+02
9.05E+02
2.20E+03
8.73E+02
2.10E+03
2.03E+03
9.01E+02
2.09E+03
9.12E+02
2.04E+03
2.09E+03
20
8.65E+02
8.92E+02
2.17E+03
8.68E+02
2.09E+03
1.99E+03
8.90E+02
2.06E+03
9.00E+02
2.03E+03
2.13E+03
30
8.48E+02
8.80E+02
2.19E+03
8.22E+02
2.03E+03
1.99E+03
8.93E+02
2.01E+03
8.88E+02
1.97E+03
2.11E+03
50
8.57E+02
8.80E+02
2.13E+03
8.49E+02
1.97E+03
1.95E+03
8.64E+02
1.93E+03
8.74E+02
1.86E+03
2.08E+03
60
8.41E+02
8.50E+02
2.11E+03
8.41E+02
1.94E+03
1.95E+03
8.62E+02
1.93E+03
8.90E+02
1.90E+03
2.14E+03
70
8.41E+02
8.50E+02
2.11E+03
8.41E+02
1.94E+03
1.95E+03
8.62E+02
1.93E+03
8.90E+02
1.90E+03
2.14E+03
1.47E+03
7.74E+02
3.59E+03
-6.57E+02
1.39E+03
6.94E+02
3.29E+03
-5.14E+02
1.38E+03
6.85E+02
3.25E+03
-5.04E+02
1.35E+03
6.92E+02
3.25E+03
-5.45E+02
1.34E+03
6.51E+02
3.12E+03
-4.50E+02
1.32E+03
6.48E+02
3.09E+03
-4.62E+02
1.32E+03
6.48E+02
3.09E+03
-4.62E+02
1.65E+03
6.73E+02
3.50E+03
-1.93E+02
5.00E+02
FAIL
1.60E+03
6.30E+02
3.32E+03
-1.32E+02
2.50E+02
FAIL
1.57E+03
6.20E+02
3.27E+03
-1.27E+02
2.50E+02
FAIL
1.55E+03
6.03E+02
3.20E+03
-1.02E+02
2.50E+02
FAIL
1.50E+03
5.74E+02
3.07E+03
-7.72E+01
2.50E+02
FAIL
1.50E+03
5.74E+02
3.08E+03
-7.00E+01
2.50E+02
FAIL
1.50E+03
5.74E+02
3.08E+03
-7.00E+01
2.50E+02
FAIL
An ISO 9001:2000 Certified Company
118
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.56. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
119
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.56. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.07E+02
9.76E+02
9.27E+02
1.17E+03
9.35E+02
1.14E+03
2.00E+03
2.12E+03
2.05E+03
1.05E+03
2.25E+03
10
8.94E+02
9.25E+02
8.94E+02
1.11E+03
8.77E+02
1.12E+03
1.92E+03
2.03E+03
1.94E+03
1.03E+03
2.10E+03
20
8.88E+02
9.35E+02
8.85E+02
1.14E+03
8.79E+02
1.14E+03
1.91E+03
1.96E+03
1.88E+03
1.03E+03
2.18E+03
30
8.34E+02
9.11E+02
8.76E+02
1.11E+03
8.74E+02
1.09E+03
1.89E+03
1.94E+03
1.87E+03
1.04E+03
1.93E+03
50
8.34E+02
9.04E+02
8.74E+02
1.07E+03
8.79E+02
1.09E+03
1.74E+03
1.87E+03
1.85E+03
9.77E+02
2.24E+03
60
8.51E+02
8.84E+02
8.53E+02
1.08E+03
8.06E+02
1.09E+03
1.77E+03
1.91E+03
1.84E+03
1.06E+03
2.11E+03
70
8.51E+02
8.84E+02
8.53E+02
1.08E+03
8.06E+02
1.09E+03
1.77E+03
1.91E+03
1.84E+03
1.06E+03
2.11E+03
9.84E+02
1.09E+02
1.28E+03
6.85E+02
9.39E+02
9.53E+01
1.20E+03
6.78E+02
9.45E+02
1.10E+02
1.25E+03
6.43E+02
9.22E+02
1.10E+02
1.22E+03
6.19E+02
9.13E+02
9.34E+01
1.17E+03
6.57E+02
8.95E+02
1.08E+02
1.19E+03
5.98E+02
8.95E+02
1.08E+02
1.19E+03
5.98E+02
1.67E+03
5.31E+02
3.13E+03
2.13E+02
5.00E+02
FAIL
1.61E+03
4.89E+02
2.95E+03
2.67E+02
2.50E+02
PASS
1.58E+03
4.59E+02
2.84E+03
3.23E+02
2.50E+02
PASS
1.57E+03
4.60E+02
2.83E+03
3.04E+02
2.50E+02
PASS
1.50E+03
4.36E+02
2.70E+03
3.09E+02
2.50E+02
PASS
1.54E+03
4.24E+02
2.70E+03
3.71E+02
2.50E+02
PASS
1.54E+03
4.24E+02
2.70E+03
3.71E+02
2.50E+02
PASS
An ISO 9001:2000 Certified Company
120
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
-5.00E+02
-1.00E+03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.57. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
121
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.57. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
2.50E+03
1.40E+03
9.13E+02
1.02E+03
2.21E+03
2.54E+03
1.89E+03
1.08E+03
9.48E+02
9.95E+02
9.39E+02
10
2.41E+03
1.33E+03
8.80E+02
9.73E+02
1.98E+03
2.48E+03
1.75E+03
1.08E+03
9.26E+02
9.78E+02
9.46E+02
20
2.31E+03
1.28E+03
8.73E+02
9.56E+02
1.99E+03
2.49E+03
1.75E+03
1.04E+03
9.25E+02
9.73E+02
9.45E+02
30
2.17E+03
1.28E+03
8.60E+02
9.50E+02
1.93E+03
2.42E+03
1.70E+03
1.06E+03
9.25E+02
9.54E+02
9.48E+02
50
2.17E+03
1.27E+03
8.48E+02
9.31E+02
1.89E+03
2.27E+03
1.57E+03
1.04E+03
9.11E+02
9.58E+02
9.59E+02
60
2.21E+03
1.24E+03
8.47E+02
9.16E+02
1.91E+03
2.30E+03
1.72E+03
1.03E+03
8.92E+02
9.53E+02
9.42E+02
70
2.21E+03
1.24E+03
8.47E+02
9.16E+02
1.91E+03
2.30E+03
1.72E+03
1.03E+03
8.92E+02
9.53E+02
9.42E+02
1.61E+03
7.13E+02
3.56E+03
-3.49E+02
1.52E+03
6.62E+02
3.33E+03
-2.99E+02
1.48E+03
6.37E+02
3.23E+03
-2.65E+02
1.44E+03
5.85E+02
3.04E+03
-1.67E+02
1.42E+03
5.84E+02
3.02E+03
-1.80E+02
1.43E+03
6.08E+02
3.09E+03
-2.42E+02
1.43E+03
6.08E+02
3.09E+03
-2.42E+02
1.49E+03
7.03E+02
3.42E+03
-4.36E+02
5.00E+02
FAIL
1.44E+03
6.68E+02
3.28E+03
-3.89E+02
2.50E+02
FAIL
1.44E+03
6.78E+02
3.30E+03
-4.24E+02
2.50E+02
FAIL
1.41E+03
6.45E+02
3.18E+03
-3.60E+02
2.50E+02
FAIL
1.35E+03
5.77E+02
2.93E+03
-2.32E+02
2.50E+02
FAIL
1.38E+03
6.13E+02
3.06E+03
-3.00E+02
2.50E+02
FAIL
1.38E+03
6.13E+02
3.06E+03
-3.00E+02
2.50E+02
FAIL
An ISO 9001:2000 Certified Company
122
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.58. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
123
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.58. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.28E+03
9.56E+02
2.24E+03
1.97E+03
1.22E+03
9.99E+02
1.05E+03
1.29E+03
9.61E+02
9.30E+02
2.18E+03
10
1.24E+03
9.13E+02
2.00E+03
1.88E+03
1.18E+03
9.82E+02
1.04E+03
1.30E+03
9.54E+02
9.29E+02
2.14E+03
20
1.23E+03
9.07E+02
2.03E+03
1.76E+03
1.17E+03
9.87E+02
1.05E+03
1.28E+03
9.54E+02
9.21E+02
2.20E+03
30
1.20E+03
8.99E+02
2.04E+03
1.79E+03
1.14E+03
9.57E+02
1.02E+03
1.21E+03
9.46E+02
9.02E+02
2.13E+03
50
1.21E+03
8.72E+02
1.94E+03
1.78E+03
1.13E+03
9.80E+02
1.01E+03
1.21E+03
9.39E+02
8.93E+02
2.13E+03
60
1.17E+03
8.64E+02
1.92E+03
1.79E+03
1.13E+03
9.55E+02
1.00E+03
1.18E+03
9.23E+02
8.82E+02
2.13E+03
70
1.17E+03
8.64E+02
1.92E+03
1.79E+03
1.13E+03
9.55E+02
1.00E+03
1.18E+03
9.23E+02
8.82E+02
2.13E+03
1.53E+03
5.47E+02
3.03E+03
3.35E+01
1.44E+03
4.71E+02
2.74E+03
1.50E+02
1.42E+03
4.61E+02
2.68E+03
1.54E+02
1.41E+03
4.80E+02
2.73E+03
9.69E+01
1.39E+03
4.53E+02
2.63E+03
1.45E+02
1.37E+03
4.56E+02
2.62E+03
1.23E+02
1.37E+03
4.56E+02
2.62E+03
1.23E+02
1.05E+03
1.41E+02
1.43E+03
6.57E+02
5.00E+02
FAIL
1.04E+03
1.51E+02
1.45E+03
6.29E+02
2.50E+02
FAIL
1.04E+03
1.44E+02
1.43E+03
6.43E+02
2.50E+02
FAIL
1.01E+03
1.22E+02
1.34E+03
6.72E+02
2.50E+02
FAIL
1.01E+03
1.24E+02
1.35E+03
6.67E+02
2.50E+02
FAIL
9.89E+02
1.17E+02
1.31E+03
6.67E+02
2.50E+02
FAIL
9.89E+02
1.17E+02
1.31E+03
6.67E+02
2.50E+02
FAIL
An ISO 9001:2000 Certified Company
124
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15
V #1 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.59. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) versus total dose.
The data show no significant change with radiation. The solid diamonds are the average of the measured data
points for the sample irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
125
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.59. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.81E+01
1.16E+02
9.99E+01
1.05E+02
1.17E+02
1.02E+02
1.02E+02
1.12E+02
9.86E+01
1.13E+02
1.13E+02
10
9.84E+01
1.16E+02
9.99E+01
1.05E+02
1.16E+02
1.02E+02
1.02E+02
1.13E+02
9.85E+01
1.14E+02
1.13E+02
20
9.84E+01
1.16E+02
9.99E+01
1.05E+02
1.16E+02
1.02E+02
1.02E+02
1.13E+02
9.85E+01
1.14E+02
1.12E+02
30
9.85E+01
1.16E+02
9.99E+01
1.05E+02
1.16E+02
1.02E+02
1.02E+02
1.13E+02
9.84E+01
1.14E+02
1.13E+02
50
9.86E+01
1.16E+02
9.98E+01
1.05E+02
1.16E+02
1.02E+02
1.02E+02
1.14E+02
9.84E+01
1.15E+02
1.13E+02
60
9.85E+01
1.16E+02
9.98E+01
1.05E+02
1.17E+02
1.02E+02
1.02E+02
1.13E+02
9.84E+01
1.14E+02
1.13E+02
70
9.85E+01
1.16E+02
9.98E+01
1.05E+02
1.17E+02
1.02E+02
1.02E+02
1.13E+02
9.84E+01
1.14E+02
1.13E+02
1.07E+02
8.96E+00
1.32E+02
8.26E+01
1.07E+02
8.51E+00
1.30E+02
8.36E+01
1.07E+02
8.36E+00
1.30E+02
8.40E+01
1.07E+02
8.60E+00
1.31E+02
8.35E+01
1.07E+02
8.54E+00
1.30E+02
8.36E+01
1.07E+02
8.77E+00
1.31E+02
8.32E+01
1.07E+02
8.77E+00
1.31E+02
8.32E+01
1.06E+02
6.54E+00
1.23E+02
8.76E+01
9.00E+01
FAIL
1.06E+02
7.11E+00
1.25E+02
8.64E+01
8.60E+01
FAIL
1.06E+02
7.23E+00
1.26E+02
8.61E+01
8.60E+01
FAIL
1.06E+02
7.32E+00
1.26E+02
8.59E+01
8.60E+01
FAIL
1.06E+02
7.48E+00
1.27E+02
8.55E+01
8.60E+01
FAIL
1.06E+02
7.30E+00
1.26E+02
8.59E+01
8.60E+01
FAIL
1.06E+02
7.30E+00
1.26E+02
8.59E+01
8.60E+01
FAIL
An ISO 9001:2000 Certified Company
126
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15
V #2 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.60. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) versus total dose.
The data show no significant change with radiation. The solid diamonds are the average of the measured data
points for the sample irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
127
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.60. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.19E+02
1.03E+02
1.04E+02
9.98E+01
1.01E+02
1.02E+02
1.03E+02
1.23E+02
1.03E+02
1.04E+02
1.08E+02
10
1.22E+02
1.03E+02
1.04E+02
1.00E+02
1.01E+02
1.02E+02
1.03E+02
1.22E+02
1.03E+02
1.05E+02
1.09E+02
20
1.22E+02
1.03E+02
1.04E+02
1.00E+02
1.01E+02
1.02E+02
1.03E+02
1.21E+02
1.03E+02
1.04E+02
1.08E+02
30
1.22E+02
1.03E+02
1.04E+02
1.00E+02
1.01E+02
1.02E+02
1.03E+02
1.20E+02
1.03E+02
1.04E+02
1.09E+02
50
1.24E+02
1.03E+02
1.04E+02
1.01E+02
1.01E+02
1.02E+02
1.02E+02
1.20E+02
1.03E+02
1.04E+02
1.08E+02
60
1.23E+02
1.03E+02
1.04E+02
1.00E+02
1.01E+02
1.02E+02
1.02E+02
1.21E+02
1.03E+02
1.04E+02
1.08E+02
70
1.23E+02
1.03E+02
1.04E+02
1.00E+02
1.01E+02
1.02E+02
1.02E+02
1.21E+02
1.03E+02
1.04E+02
1.08E+02
1.05E+02
7.72E+00
1.26E+02
8.40E+01
1.06E+02
8.98E+00
1.30E+02
8.12E+01
1.06E+02
8.88E+00
1.30E+02
8.15E+01
1.06E+02
9.11E+00
1.31E+02
8.10E+01
1.06E+02
1.01E+01
1.34E+02
7.87E+01
1.06E+02
9.57E+00
1.32E+02
7.99E+01
1.06E+02
9.57E+00
1.32E+02
7.99E+01
1.07E+02
8.82E+00
1.31E+02
8.30E+01
9.00E+01
FAIL
1.07E+02
8.31E+00
1.30E+02
8.41E+01
8.60E+01
FAIL
1.07E+02
8.02E+00
1.29E+02
8.47E+01
8.60E+01
FAIL
1.07E+02
7.84E+00
1.28E+02
8.50E+01
8.60E+01
FAIL
1.06E+02
7.70E+00
1.27E+02
8.52E+01
8.60E+01
FAIL
1.07E+02
8.03E+00
1.29E+02
8.45E+01
8.60E+01
FAIL
1.07E+02
8.03E+00
1.29E+02
8.45E+01
8.60E+01
FAIL
An ISO 9001:2000 Certified Company
128
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15
V #3 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.61. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB) versus total dose.
The data show no significant change with radiation. The solid diamonds are the average of the measured data
points for the sample irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
129
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.61. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.06E+02
9.92E+01
9.79E+01
9.92E+01
1.11E+02
1.05E+02
1.06E+02
9.82E+01
1.05E+02
9.98E+01
9.77E+01
10
1.05E+02
9.94E+01
9.78E+01
9.92E+01
1.11E+02
1.05E+02
1.06E+02
9.82E+01
1.05E+02
9.98E+01
9.78E+01
20
1.05E+02
9.95E+01
9.79E+01
9.92E+01
1.11E+02
1.05E+02
1.06E+02
9.82E+01
1.05E+02
9.98E+01
9.78E+01
30
1.05E+02
9.95E+01
9.79E+01
9.92E+01
1.10E+02
1.04E+02
1.05E+02
9.82E+01
1.05E+02
9.98E+01
9.78E+01
50
1.05E+02
9.96E+01
9.82E+01
9.92E+01
1.10E+02
1.04E+02
1.05E+02
9.83E+01
1.05E+02
9.98E+01
9.77E+01
60
1.05E+02
9.96E+01
9.81E+01
9.91E+01
1.10E+02
1.04E+02
1.05E+02
9.82E+01
1.05E+02
9.98E+01
9.78E+01
70
1.05E+02
9.96E+01
9.81E+01
9.91E+01
1.10E+02
1.04E+02
1.05E+02
9.82E+01
1.05E+02
9.98E+01
9.78E+01
1.03E+02
5.48E+00
1.18E+02
8.75E+01
1.03E+02
5.41E+00
1.17E+02
8.77E+01
1.02E+02
5.32E+00
1.17E+02
8.79E+01
1.02E+02
5.23E+00
1.17E+02
8.81E+01
1.02E+02
4.99E+00
1.16E+02
8.87E+01
1.02E+02
5.20E+00
1.17E+02
8.82E+01
1.02E+02
5.20E+00
1.17E+02
8.82E+01
1.03E+02
3.58E+00
1.13E+02
9.31E+01
9.00E+01
FAIL
1.03E+02
3.44E+00
1.12E+02
9.33E+01
8.60E+01
PASS
1.03E+02
3.38E+00
1.12E+02
9.34E+01
8.60E+01
PASS
1.03E+02
3.34E+00
1.12E+02
9.34E+01
8.60E+01
PASS
1.03E+02
3.29E+00
1.12E+02
9.35E+01
8.60E+01
PASS
1.03E+02
3.33E+00
1.12E+02
9.34E+01
8.60E+01
PASS
1.03E+02
3.33E+00
1.12E+02
9.34E+01
8.60E+01
PASS
An ISO 9001:2000 Certified Company
130
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15
V #4 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.62. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB) versus total dose.
The data show no significant change with radiation. The solid diamonds are the average of the measured data
points for the sample irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
131
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.62. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.16E+02
1.08E+02
1.03E+02
1.05E+02
1.36E+02
1.03E+02
1.03E+02
9.77E+01
9.92E+01
1.06E+02
1.08E+02
10
1.14E+02
1.08E+02
1.03E+02
1.05E+02
1.30E+02
1.03E+02
1.03E+02
9.75E+01
9.92E+01
1.06E+02
1.08E+02
20
1.13E+02
1.08E+02
1.03E+02
1.05E+02
1.29E+02
1.03E+02
1.03E+02
9.74E+01
9.92E+01
1.06E+02
1.08E+02
30
1.13E+02
1.08E+02
1.03E+02
1.04E+02
1.29E+02
1.03E+02
1.03E+02
9.74E+01
9.91E+01
1.06E+02
1.08E+02
50
1.12E+02
1.08E+02
1.03E+02
1.04E+02
1.26E+02
1.03E+02
1.03E+02
9.73E+01
9.90E+01
1.06E+02
1.08E+02
60
1.13E+02
1.08E+02
1.03E+02
1.04E+02
1.28E+02
1.03E+02
1.03E+02
9.73E+01
9.90E+01
1.06E+02
1.08E+02
70
1.13E+02
1.08E+02
1.03E+02
1.04E+02
1.28E+02
1.03E+02
1.03E+02
9.73E+01
9.90E+01
1.06E+02
1.08E+02
1.13E+02
1.36E+01
1.51E+02
7.62E+01
1.12E+02
1.08E+01
1.41E+02
8.20E+01
1.11E+02
1.05E+01
1.40E+02
8.25E+01
1.11E+02
1.06E+01
1.41E+02
8.23E+01
1.11E+02
9.22E+00
1.36E+02
8.53E+01
1.11E+02
1.01E+01
1.39E+02
8.34E+01
1.11E+02
1.01E+01
1.39E+02
8.34E+01
1.02E+02
3.45E+00
1.11E+02
9.24E+01
9.00E+01
FAIL
1.02E+02
3.41E+00
1.11E+02
9.24E+01
8.60E+01
FAIL
1.02E+02
3.40E+00
1.11E+02
9.24E+01
8.60E+01
FAIL
1.02E+02
3.41E+00
1.11E+02
9.24E+01
8.60E+01
FAIL
1.02E+02
3.44E+00
1.11E+02
9.22E+01
8.60E+01
FAIL
1.02E+02
3.42E+00
1.11E+02
9.22E+01
8.60E+01
FAIL
1.02E+02
3.42E+00
1.11E+02
9.22E+01
8.60E+01
FAIL
An ISO 9001:2000 Certified Company
132
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching 1-4 @ +/- 15
V, VCM=+/- 15 V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.63. Plot of Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB) versus
total dose. The data show no significant change with radiation. The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
133
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.63. Raw data for Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V,
VCM=+/- 15 V (dB) versus total dose, including the statistical analysis, specification and the
status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
0
9.93E+01
1.12E+02
1.11E+02
1.39E+02
1.18E+02
1.21E+02
1.21E+02
9.61E+01
1.22E+02
1.03E+02
1.17E+02
10
1.00E+02
1.12E+02
1.11E+02
1.39E+02
1.18E+02
1.21E+02
1.20E+02
9.62E+01
1.21E+02
1.03E+02
1.16E+02
20
1.00E+02
1.12E+02
1.11E+02
1.38E+02
1.18E+02
1.21E+02
1.20E+02
9.61E+01
1.21E+02
1.03E+02
1.16E+02
30
1.00E+02
1.12E+02
1.11E+02
1.32E+02
1.19E+02
1.21E+02
1.20E+02
9.61E+01
1.21E+02
1.03E+02
1.16E+02
50
1.01E+02
1.12E+02
1.10E+02
1.31E+02
1.20E+02
1.20E+02
1.19E+02
9.61E+01
1.21E+02
1.03E+02
1.16E+02
60
1.00E+02
1.12E+02
1.10E+02
1.29E+02
1.20E+02
1.21E+02
1.20E+02
9.60E+01
1.21E+02
1.03E+02
1.16E+02
70
1.00E+02
1.12E+02
1.10E+02
1.29E+02
1.20E+02
1.21E+02
1.20E+02
9.60E+01
1.21E+02
1.03E+02
1.16E+02
1.16E+02
1.47E+01
1.56E+02
7.55E+01
1.16E+02
1.43E+01
1.55E+02
7.68E+01
1.16E+02
1.40E+01
1.54E+02
7.74E+01
1.15E+02
1.18E+01
1.47E+02
8.24E+01
1.15E+02
1.14E+01
1.46E+02
8.34E+01
1.14E+02
1.08E+01
1.44E+02
8.46E+01
1.14E+02
1.08E+01
1.44E+02
8.46E+01
1.13E+02
1.23E+01
1.47E+02
7.91E+01
8.40E+01
FAIL
1.12E+02
1.19E+01
1.45E+02
7.98E+01
8.30E+01
FAIL
1.12E+02
1.18E+01
1.45E+02
7.99E+01
8.30E+01
FAIL
1.12E+02
1.17E+01
1.44E+02
8.01E+01
8.30E+01
FAIL
1.12E+02
1.14E+01
1.43E+02
8.04E+01
8.30E+01
FAIL
1.12E+02
1.18E+01
1.45E+02
7.98E+01
8.30E+01
FAIL
1.12E+02
1.18E+01
1.45E+02
7.98E+01
8.30E+01
FAIL
An ISO 9001:2000 Certified Company
134
24 hr
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching 2-3 @ +/- 15
V, VCM=+/- 15 V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.64. Plot of Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB) versus
total dose. The data show no significant change with radiation. The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
135
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.64. Raw data for Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V,
VCM=+/- 15 V (dB) versus total dose, including the statistical analysis, specification and the
status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
168 hr
Anneal
0
1.04E+02
1.08E+02
1.04E+02
1.24E+02
1.04E+02
1.14E+02
1.13E+02
9.87E+01
1.16E+02
1.07E+02
1.01E+02
10
1.04E+02
1.09E+02
1.04E+02
1.19E+02
1.04E+02
1.14E+02
1.14E+02
9.88E+01
1.18E+02
1.07E+02
1.01E+02
20
1.04E+02
1.09E+02
1.04E+02
1.18E+02
1.04E+02
1.14E+02
1.14E+02
9.89E+01
1.17E+02
1.07E+02
1.01E+02
30
1.04E+02
1.09E+02
1.04E+02
1.17E+02
1.04E+02
1.14E+02
1.14E+02
9.89E+01
1.17E+02
1.08E+02
1.01E+02
50
1.04E+02
1.10E+02
1.05E+02
1.16E+02
1.04E+02
1.15E+02
1.13E+02
9.90E+01
1.17E+02
1.08E+02
1.01E+02
60
1.04E+02
1.10E+02
1.04E+02
1.16E+02
1.04E+02
1.15E+02
1.13E+02
9.88E+01
1.17E+02
1.08E+02
1.01E+02
70
1.04E+02
1.10E+02
1.04E+02
1.16E+02
1.04E+02
1.15E+02
1.13E+02
9.88E+01
1.17E+02
1.08E+02
1.01E+02
1.09E+02
8.46E+00
1.32E+02
8.56E+01
1.08E+02
6.47E+00
1.26E+02
9.03E+01
1.08E+02
5.97E+00
1.24E+02
9.15E+01
1.08E+02
5.61E+00
1.23E+02
9.24E+01
1.08E+02
5.22E+00
1.22E+02
9.35E+01
1.08E+02
5.14E+00
1.22E+02
9.36E+01
1.08E+02
5.14E+00
1.22E+02
9.36E+01
1.10E+02
7.07E+00
1.29E+02
9.06E+01
8.40E+01
PASS
1.10E+02
7.35E+00
1.30E+02
9.00E+01
8.30E+01
PASS
1.10E+02
7.32E+00
1.30E+02
9.02E+01
8.30E+01
PASS
1.10E+02
7.32E+00
1.30E+02
9.03E+01
8.30E+01
PASS
1.10E+02
7.11E+00
1.30E+02
9.08E+01
8.30E+01
PASS
1.10E+02
7.21E+00
1.30E+02
9.05E+01
8.30E+01
PASS
1.10E+02
7.21E+00
1.30E+02
9.05E+01
8.30E+01
PASS
An ISO 9001:2000 Certified Company
136
24 hr
Anneal
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1
(dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.65. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
137
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.65. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.07E+02
1.03E+02
1.03E+02
1.54E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.24E+02
1.12E+02
10
1.07E+02
1.03E+02
1.03E+02
1.43E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.24E+02
1.12E+02
20
1.07E+02
1.03E+02
1.03E+02
1.41E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.24E+02
1.12E+02
30
1.07E+02
1.03E+02
1.03E+02
1.39E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.24E+02
1.12E+02
50
1.07E+02
1.03E+02
1.03E+02
1.36E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.24E+02
1.12E+02
60
1.07E+02
1.03E+02
1.03E+02
1.38E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.23E+02
1.12E+02
70
1.07E+02
1.03E+02
1.03E+02
1.38E+02
1.10E+02
1.13E+02
1.12E+02
1.13E+02
1.09E+02
1.23E+02
1.12E+02
1.15E+02
2.20E+01
1.76E+02
5.50E+01
1.13E+02
1.69E+01
1.59E+02
6.67E+01
1.13E+02
1.60E+01
1.57E+02
6.88E+01
1.12E+02
1.54E+01
1.54E+02
7.02E+01
1.12E+02
1.41E+01
1.50E+02
7.32E+01
1.12E+02
1.51E+01
1.53E+02
7.08E+01
1.12E+02
1.51E+01
1.53E+02
7.08E+01
1.14E+02
5.61E+00
1.30E+02
9.87E+01
9.00E+01
FAIL
1.14E+02
5.50E+00
1.29E+02
9.90E+01
9.00E+01
FAIL
1.14E+02
5.56E+00
1.29E+02
9.89E+01
9.00E+01
FAIL
1.14E+02
5.57E+00
1.29E+02
9.88E+01
9.00E+01
FAIL
1.14E+02
5.48E+00
1.29E+02
9.91E+01
9.00E+01
FAIL
1.14E+02
5.40E+00
1.29E+02
9.92E+01
9.00E+01
FAIL
1.14E+02
5.40E+00
1.29E+02
9.92E+01
9.00E+01
FAIL
An ISO 9001:2000 Certified Company
138
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2
(dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.66. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
139
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.66. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.15E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.83E+01
1.25E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
10
1.15E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.82E+01
1.25E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
20
1.16E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.82E+01
1.24E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
30
1.16E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.82E+01
1.25E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
50
1.16E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.82E+01
1.24E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
60
1.16E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.82E+01
1.24E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
70
1.16E+02
1.14E+02
1.21E+02
1.04E+02
1.06E+02
9.82E+01
1.24E+02
1.10E+02
1.05E+02
1.06E+02
1.05E+02
1.12E+02
6.84E+00
1.31E+02
9.33E+01
1.12E+02
6.95E+00
1.31E+02
9.30E+01
1.12E+02
6.93E+00
1.31E+02
9.31E+01
1.12E+02
6.93E+00
1.31E+02
9.30E+01
1.12E+02
7.12E+00
1.32E+02
9.27E+01
1.12E+02
7.01E+00
1.31E+02
9.28E+01
1.12E+02
7.01E+00
1.31E+02
9.28E+01
1.09E+02
9.75E+00
1.36E+02
8.21E+01
9.00E+01
FAIL
1.09E+02
9.75E+00
1.36E+02
8.21E+01
9.00E+01
FAIL
1.09E+02
9.69E+00
1.35E+02
8.23E+01
9.00E+01
FAIL
1.09E+02
9.83E+00
1.36E+02
8.19E+01
9.00E+01
FAIL
1.09E+02
9.52E+00
1.35E+02
8.27E+01
9.00E+01
FAIL
1.09E+02
9.39E+00
1.34E+02
8.29E+01
9.00E+01
FAIL
1.09E+02
9.39E+00
1.34E+02
8.29E+01
9.00E+01
FAIL
An ISO 9001:2000 Certified Company
140
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3
(dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.67. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
141
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.67. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.02E+02
1.05E+02
1.03E+02
1.05E+02
1.05E+02
1.03E+02
1.11E+02
1.06E+02
1.25E+02
1.22E+02
1.09E+02
10
1.02E+02
1.05E+02
1.03E+02
1.04E+02
1.05E+02
1.03E+02
1.11E+02
1.06E+02
1.25E+02
1.22E+02
1.09E+02
20
1.02E+02
1.05E+02
1.03E+02
1.04E+02
1.05E+02
1.03E+02
1.10E+02
1.06E+02
1.25E+02
1.22E+02
1.09E+02
30
1.02E+02
1.05E+02
1.03E+02
1.04E+02
1.05E+02
1.03E+02
1.10E+02
1.05E+02
1.25E+02
1.22E+02
1.09E+02
50
1.02E+02
1.05E+02
1.03E+02
1.04E+02
1.05E+02
1.03E+02
1.10E+02
1.05E+02
1.26E+02
1.22E+02
1.09E+02
60
1.02E+02
1.05E+02
1.03E+02
1.04E+02
1.05E+02
1.03E+02
1.10E+02
1.05E+02
1.25E+02
1.22E+02
1.09E+02
70
1.02E+02
1.05E+02
1.03E+02
1.04E+02
1.05E+02
1.03E+02
1.10E+02
1.05E+02
1.25E+02
1.22E+02
1.09E+02
1.04E+02
1.40E+00
1.08E+02
1.00E+02
1.04E+02
1.31E+00
1.07E+02
1.00E+02
1.04E+02
1.27E+00
1.07E+02
1.00E+02
1.04E+02
1.27E+00
1.07E+02
1.00E+02
1.04E+02
1.24E+00
1.07E+02
1.01E+02
1.04E+02
1.27E+00
1.07E+02
1.00E+02
1.04E+02
1.27E+00
1.07E+02
1.00E+02
1.13E+02
9.97E+00
1.41E+02
8.60E+01
9.00E+01
FAIL
1.13E+02
9.88E+00
1.40E+02
8.60E+01
9.00E+01
FAIL
1.13E+02
1.00E+01
1.41E+02
8.57E+01
9.00E+01
FAIL
1.13E+02
9.92E+00
1.40E+02
8.59E+01
9.00E+01
FAIL
1.13E+02
1.01E+01
1.41E+02
8.56E+01
9.00E+01
FAIL
1.13E+02
9.93E+00
1.40E+02
8.59E+01
9.00E+01
FAIL
1.13E+02
9.93E+00
1.40E+02
8.59E+01
9.00E+01
FAIL
An ISO 9001:2000 Certified Company
142
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4
(dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.30E+02
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.68. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
143
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.68. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.31E+02
1.08E+02
1.04E+02
1.10E+02
1.57E+02
1.05E+02
1.04E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
10
1.31E+02
1.08E+02
1.04E+02
1.09E+02
1.46E+02
1.05E+02
1.04E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
20
1.31E+02
1.08E+02
1.04E+02
1.09E+02
1.49E+02
1.05E+02
1.04E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
30
1.31E+02
1.08E+02
1.04E+02
1.10E+02
1.49E+02
1.05E+02
1.04E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
50
1.32E+02
1.08E+02
1.04E+02
1.10E+02
1.49E+02
1.05E+02
1.03E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
60
1.31E+02
1.08E+02
1.04E+02
1.09E+02
1.53E+02
1.05E+02
1.03E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
70
1.31E+02
1.08E+02
1.04E+02
1.09E+02
1.53E+02
1.05E+02
1.03E+02
1.02E+02
1.07E+02
1.02E+02
1.06E+02
1.22E+02
2.21E+01
1.83E+02
6.14E+01
1.20E+02
1.78E+01
1.69E+02
7.08E+01
1.20E+02
1.91E+01
1.73E+02
6.81E+01
1.20E+02
1.90E+01
1.72E+02
6.83E+01
1.21E+02
1.91E+01
1.73E+02
6.82E+01
1.21E+02
2.06E+01
1.78E+02
6.47E+01
1.21E+02
2.06E+01
1.78E+02
6.47E+01
1.04E+02
2.12E+00
1.10E+02
9.83E+01
9.00E+01
FAIL
1.04E+02
2.13E+00
1.10E+02
9.83E+01
9.00E+01
FAIL
1.04E+02
2.14E+00
1.10E+02
9.82E+01
9.00E+01
FAIL
1.04E+02
2.15E+00
1.10E+02
9.82E+01
9.00E+01
FAIL
1.04E+02
2.15E+00
1.10E+02
9.82E+01
9.00E+01
FAIL
1.04E+02
2.16E+00
1.10E+02
9.81E+01
9.00E+01
FAIL
1.04E+02
2.16E+00
1.10E+02
9.81E+01
9.00E+01
FAIL
An ISO 9001:2000 Certified Company
144
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to
+/- 16 V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.69. Plot of Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB) versus total dose.
The data show no significant change with radiation. The solid diamonds are the average of the measured data
points for the sample irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
145
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.69. Raw data for Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.06E+02
1.09E+02
1.18E+02
1.10E+02
1.10E+02
1.10E+02
1.01E+02
1.06E+02
1.21E+02
1.01E+02
1.13E+02
10
1.07E+02
1.09E+02
1.19E+02
1.09E+02
1.10E+02
1.10E+02
1.01E+02
1.06E+02
1.21E+02
1.01E+02
1.13E+02
20
1.07E+02
1.09E+02
1.19E+02
1.09E+02
1.10E+02
1.10E+02
1.01E+02
1.06E+02
1.21E+02
1.01E+02
1.13E+02
30
1.07E+02
1.09E+02
1.19E+02
1.09E+02
1.10E+02
1.10E+02
1.01E+02
1.06E+02
1.21E+02
1.01E+02
1.13E+02
50
1.07E+02
1.09E+02
1.19E+02
1.09E+02
1.10E+02
1.10E+02
1.01E+02
1.06E+02
1.20E+02
1.01E+02
1.13E+02
60
1.06E+02
1.09E+02
1.19E+02
1.09E+02
1.10E+02
1.10E+02
1.01E+02
1.05E+02
1.21E+02
1.01E+02
1.13E+02
70
1.06E+02
1.09E+02
1.19E+02
1.09E+02
1.10E+02
1.10E+02
1.01E+02
1.05E+02
1.21E+02
1.01E+02
1.13E+02
1.11E+02
4.45E+00
1.23E+02
9.85E+01
1.11E+02
4.57E+00
1.23E+02
9.82E+01
1.11E+02
4.78E+00
1.24E+02
9.77E+01
1.11E+02
4.59E+00
1.23E+02
9.81E+01
1.11E+02
4.67E+00
1.24E+02
9.81E+01
1.11E+02
4.64E+00
1.23E+02
9.79E+01
1.11E+02
4.64E+00
1.23E+02
9.79E+01
1.08E+02
8.27E+00
1.31E+02
8.52E+01
8.30E+01
PASS
1.08E+02
8.24E+00
1.30E+02
8.52E+01
8.30E+01
PASS
1.08E+02
8.24E+00
1.30E+02
8.51E+01
8.30E+01
PASS
1.08E+02
8.15E+00
1.30E+02
8.54E+01
8.30E+01
PASS
1.08E+02
8.10E+00
1.30E+02
8.54E+01
8.30E+01
PASS
1.08E+02
8.20E+00
1.30E+02
8.52E+01
8.30E+01
PASS
1.08E+02
8.20E+00
1.30E+02
8.52E+01
8.30E+01
PASS
An ISO 9001:2000 Certified Company
146
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to
+/- 16 V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.70. Plot of Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB) versus total dose.
The data show no significant change with radiation. The solid diamonds are the average of the measured data
points for the sample irradiated under electrical bias while the shaded diamonds are the average of the
measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed)
are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
147
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.70. Raw data for Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V
(dB) versus total dose, including the statistical analysis, specification and the status of the
testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.04E+02
1.08E+02
1.05E+02
1.41E+02
1.25E+02
1.06E+02
1.13E+02
1.14E+02
1.06E+02
1.05E+02
1.01E+02
10
1.04E+02
1.08E+02
1.04E+02
1.32E+02
1.24E+02
1.06E+02
1.12E+02
1.14E+02
1.06E+02
1.05E+02
1.01E+02
20
1.04E+02
1.08E+02
1.05E+02
1.30E+02
1.24E+02
1.06E+02
1.12E+02
1.13E+02
1.06E+02
1.05E+02
1.00E+02
30
1.04E+02
1.08E+02
1.04E+02
1.29E+02
1.24E+02
1.06E+02
1.12E+02
1.13E+02
1.06E+02
1.05E+02
1.01E+02
50
1.04E+02
1.08E+02
1.05E+02
1.24E+02
1.23E+02
1.06E+02
1.12E+02
1.13E+02
1.06E+02
1.05E+02
1.01E+02
60
1.04E+02
1.08E+02
1.04E+02
1.28E+02
1.24E+02
1.06E+02
1.12E+02
1.13E+02
1.06E+02
1.05E+02
1.01E+02
70
1.04E+02
1.08E+02
1.04E+02
1.28E+02
1.24E+02
1.06E+02
1.12E+02
1.13E+02
1.06E+02
1.05E+02
1.01E+02
1.16E+02
1.59E+01
1.60E+02
7.29E+01
1.15E+02
1.29E+01
1.50E+02
7.93E+01
1.14E+02
1.18E+01
1.47E+02
8.16E+01
1.14E+02
1.15E+01
1.45E+02
8.22E+01
1.13E+02
1.01E+01
1.41E+02
8.52E+01
1.14E+02
1.15E+01
1.45E+02
8.22E+01
1.14E+02
1.15E+01
1.45E+02
8.22E+01
1.09E+02
4.25E+00
1.20E+02
9.71E+01
8.30E+01
FAIL
1.09E+02
4.04E+00
1.20E+02
9.75E+01
8.30E+01
FAIL
1.09E+02
3.91E+00
1.19E+02
9.79E+01
8.30E+01
FAIL
1.08E+02
3.94E+00
1.19E+02
9.77E+01
8.30E+01
FAIL
1.08E+02
3.90E+00
1.19E+02
9.78E+01
8.30E+01
PASS
1.09E+02
3.97E+00
1.19E+02
9.76E+01
8.30E+01
FAIL
1.09E+02
3.97E+00
1.19E+02
9.76E+01
8.30E+01
FAIL
An ISO 9001:2000 Certified Company
148
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.71. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
149
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.71. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.91E-03
5.47E-03
5.74E-03
5.46E-03
5.57E-03
5.51E-03
5.49E-03
5.49E-03
5.17E-03
5.73E-03
5.71E-03
10
5.73E-03
5.53E-03
5.70E-03
5.58E-03
5.38E-03
5.55E-03
5.47E-03
5.62E-03
5.26E-03
5.60E-03
5.45E-03
20
5.92E-03
5.73E-03
5.76E-03
5.60E-03
5.56E-03
5.71E-03
5.70E-03
5.53E-03
5.51E-03
5.65E-03
5.75E-03
30
6.00E-03
5.65E-03
5.77E-03
5.58E-03
5.72E-03
5.73E-03
5.72E-03
5.60E-03
5.50E-03
5.70E-03
5.63E-03
50
6.05E-03
5.86E-03
5.76E-03
5.64E-03
5.78E-03
5.76E-03
5.80E-03
5.71E-03
5.59E-03
5.69E-03
5.68E-03
60
6.03E-03
5.83E-03
6.03E-03
5.67E-03
5.84E-03
5.79E-03
5.84E-03
5.67E-03
5.57E-03
5.73E-03
5.79E-03
70
6.03E-03
5.83E-03
6.03E-03
5.67E-03
5.84E-03
5.79E-03
5.84E-03
5.67E-03
5.57E-03
5.73E-03
5.79E-03
5.63E-03
1.93E-04
6.16E-03
5.10E-03
5.58E-03
1.41E-04
5.97E-03
5.20E-03
5.71E-03
1.43E-04
6.11E-03
5.32E-03
5.74E-03
1.60E-04
6.18E-03
5.31E-03
5.82E-03
1.52E-04
6.23E-03
5.40E-03
5.88E-03
1.53E-04
6.30E-03
5.46E-03
5.88E-03
1.53E-04
6.30E-03
5.46E-03
5.48E-03
2.00E-04
6.03E-03
4.93E-03
1.00E-02
PASS
5.50E-03
1.46E-04
5.90E-03
5.10E-03
2.00E-02
PASS
5.62E-03
9.43E-05
5.88E-03
5.36E-03
2.00E-02
PASS
5.65E-03
9.85E-05
5.92E-03
5.38E-03
2.00E-02
PASS
5.71E-03
7.97E-05
5.93E-03
5.49E-03
2.00E-02
PASS
5.72E-03
1.05E-04
6.01E-03
5.43E-03
2.00E-02
PASS
5.72E-03
1.05E-04
6.01E-03
5.43E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
150
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.72. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
151
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.72. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.57E-03
5.86E-03
5.39E-03
5.67E-03
5.56E-03
5.59E-03
5.52E-03
5.69E-03
5.49E-03
5.56E-03
5.46E-03
10
5.65E-03
5.94E-03
5.45E-03
5.58E-03
5.52E-03
5.70E-03
5.62E-03
5.62E-03
5.43E-03
5.62E-03
5.30E-03
20
5.58E-03
6.00E-03
5.46E-03
5.87E-03
5.53E-03
5.55E-03
5.68E-03
5.65E-03
5.55E-03
5.61E-03
5.65E-03
30
5.87E-03
6.00E-03
5.51E-03
5.83E-03
5.55E-03
5.63E-03
5.72E-03
5.58E-03
5.51E-03
5.80E-03
5.48E-03
50
5.81E-03
6.12E-03
5.54E-03
5.93E-03
5.61E-03
5.64E-03
5.86E-03
5.86E-03
5.66E-03
5.78E-03
5.37E-03
60
5.84E-03
6.13E-03
5.67E-03
6.01E-03
5.79E-03
5.84E-03
5.84E-03
5.66E-03
5.64E-03
5.81E-03
5.49E-03
70
5.84E-03
6.13E-03
5.67E-03
6.01E-03
5.79E-03
5.84E-03
5.84E-03
5.66E-03
5.64E-03
5.81E-03
5.49E-03
5.61E-03
1.72E-04
6.08E-03
5.14E-03
5.63E-03
1.89E-04
6.15E-03
5.11E-03
5.69E-03
2.34E-04
6.33E-03
5.05E-03
5.75E-03
2.13E-04
6.34E-03
5.17E-03
5.80E-03
2.36E-04
6.45E-03
5.15E-03
5.89E-03
1.82E-04
6.39E-03
5.39E-03
5.89E-03
1.82E-04
6.39E-03
5.39E-03
5.57E-03
7.71E-05
5.78E-03
5.36E-03
1.00E-02
PASS
5.60E-03
1.00E-04
5.87E-03
5.32E-03
2.00E-02
PASS
5.61E-03
5.85E-05
5.77E-03
5.45E-03
2.00E-02
PASS
5.65E-03
1.14E-04
5.96E-03
5.33E-03
2.00E-02
PASS
5.76E-03
1.06E-04
6.05E-03
5.47E-03
2.00E-02
PASS
5.76E-03
9.96E-05
6.03E-03
5.48E-03
2.00E-02
PASS
5.76E-03
9.96E-05
6.03E-03
5.48E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
152
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.73. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
153
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.73. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.81E-03
5.69E-03
5.35E-03
5.57E-03
5.51E-03
5.51E-03
5.52E-03
5.46E-03
5.35E-03
5.57E-03
5.49E-03
10
5.41E-03
5.62E-03
5.47E-03
5.67E-03
5.43E-03
5.55E-03
5.47E-03
5.50E-03
5.47E-03
5.65E-03
5.48E-03
20
5.71E-03
5.78E-03
5.44E-03
5.75E-03
5.61E-03
5.58E-03
5.60E-03
5.55E-03
5.63E-03
5.70E-03
5.55E-03
30
5.75E-03
5.92E-03
5.55E-03
5.85E-03
5.60E-03
5.63E-03
5.65E-03
5.51E-03
5.51E-03
5.68E-03
5.53E-03
50
5.76E-03
6.01E-03
5.53E-03
5.86E-03
5.66E-03
5.63E-03
5.81E-03
5.59E-03
5.61E-03
5.68E-03
5.51E-03
60
5.79E-03
5.93E-03
5.57E-03
6.00E-03
5.79E-03
5.88E-03
5.66E-03
5.59E-03
5.67E-03
5.78E-03
5.41E-03
70
5.79E-03
5.93E-03
5.57E-03
6.00E-03
5.79E-03
5.88E-03
5.66E-03
5.59E-03
5.67E-03
5.78E-03
5.41E-03
5.59E-03
1.75E-04
6.07E-03
5.11E-03
5.52E-03
1.17E-04
5.84E-03
5.20E-03
5.66E-03
1.38E-04
6.04E-03
5.28E-03
5.73E-03
1.58E-04
6.17E-03
5.30E-03
5.76E-03
1.84E-04
6.27E-03
5.26E-03
5.82E-03
1.65E-04
6.27E-03
5.36E-03
5.82E-03
1.65E-04
6.27E-03
5.36E-03
5.48E-03
8.35E-05
5.71E-03
5.25E-03
1.00E-02
PASS
5.53E-03
7.56E-05
5.74E-03
5.32E-03
2.00E-02
PASS
5.61E-03
5.72E-05
5.77E-03
5.46E-03
2.00E-02
PASS
5.60E-03
8.05E-05
5.82E-03
5.38E-03
2.00E-02
PASS
5.66E-03
8.82E-05
5.91E-03
5.42E-03
2.00E-02
PASS
5.72E-03
1.14E-04
6.03E-03
5.40E-03
2.00E-02
PASS
5.72E-03
1.14E-04
6.03E-03
5.40E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
154
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.74. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
155
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.74. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.05E-03
5.51E-03
5.54E-03
5.52E-03
5.49E-03
5.62E-03
5.51E-03
5.49E-03
5.30E-03
5.73E-03
5.66E-03
10
5.95E-03
5.53E-03
5.65E-03
5.65E-03
5.38E-03
5.70E-03
5.50E-03
5.67E-03
5.35E-03
5.60E-03
5.60E-03
20
6.07E-03
5.60E-03
5.49E-03
5.56E-03
5.66E-03
5.70E-03
5.58E-03
5.83E-03
5.49E-03
5.70E-03
5.76E-03
30
6.02E-03
5.68E-03
5.78E-03
5.46E-03
5.73E-03
5.72E-03
5.68E-03
5.77E-03
5.48E-03
5.70E-03
5.77E-03
50
6.27E-03
5.75E-03
5.75E-03
5.73E-03
5.71E-03
5.83E-03
5.66E-03
5.71E-03
5.48E-03
5.86E-03
5.63E-03
60
6.20E-03
5.83E-03
5.64E-03
5.78E-03
5.86E-03
5.76E-03
5.73E-03
5.86E-03
5.57E-03
5.91E-03
5.67E-03
70
6.20E-03
5.83E-03
5.64E-03
5.78E-03
5.86E-03
5.76E-03
5.73E-03
5.86E-03
5.57E-03
5.91E-03
5.67E-03
5.62E-03
2.40E-04
6.28E-03
4.96E-03
5.63E-03
2.10E-04
6.21E-03
5.06E-03
5.68E-03
2.29E-04
6.30E-03
5.05E-03
5.73E-03
2.01E-04
6.29E-03
5.18E-03
5.84E-03
2.40E-04
6.50E-03
5.18E-03
5.86E-03
2.07E-04
6.43E-03
5.29E-03
5.86E-03
2.07E-04
6.43E-03
5.29E-03
5.53E-03
1.60E-04
5.97E-03
5.09E-03
1.00E-02
PASS
5.56E-03
1.42E-04
5.95E-03
5.17E-03
2.00E-02
PASS
5.66E-03
1.30E-04
6.02E-03
5.30E-03
2.00E-02
PASS
5.67E-03
1.11E-04
5.98E-03
5.36E-03
2.00E-02
PASS
5.71E-03
1.52E-04
6.12E-03
5.29E-03
2.00E-02
PASS
5.77E-03
1.32E-04
6.13E-03
5.41E-03
2.00E-02
PASS
5.77E-03
1.32E-04
6.13E-03
5.41E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
156
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.75. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
157
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.75. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.50E-02
7.24E-02
7.30E-02
7.17E-02
7.22E-02
7.38E-02
7.20E-02
7.27E-02
7.17E-02
7.39E-02
7.41E-02
10
7.55E-02
7.38E-02
7.39E-02
7.26E-02
7.31E-02
7.42E-02
7.24E-02
7.30E-02
7.20E-02
7.42E-02
7.38E-02
20
7.60E-02
7.41E-02
7.45E-02
7.33E-02
7.37E-02
7.47E-02
7.29E-02
7.34E-02
7.23E-02
7.47E-02
7.37E-02
30
7.66E-02
7.48E-02
7.51E-02
7.37E-02
7.43E-02
7.49E-02
7.29E-02
7.35E-02
7.27E-02
7.50E-02
7.38E-02
50
7.73E-02
7.49E-02
7.54E-02
7.39E-02
7.47E-02
7.54E-02
7.34E-02
7.40E-02
7.32E-02
7.54E-02
7.40E-02
60
7.81E-02
7.57E-02
7.61E-02
7.47E-02
7.51E-02
7.56E-02
7.37E-02
7.43E-02
7.35E-02
7.55E-02
7.38E-02
70
7.81E-02
7.57E-02
7.61E-02
7.47E-02
7.51E-02
7.56E-02
7.37E-02
7.43E-02
7.35E-02
7.55E-02
7.38E-02
7.28E-02
1.29E-03
7.64E-02
6.93E-02
7.38E-02
1.10E-03
7.68E-02
7.07E-02
7.43E-02
1.06E-03
7.72E-02
7.14E-02
7.49E-02
1.10E-03
7.79E-02
7.19E-02
7.52E-02
1.27E-03
7.87E-02
7.17E-02
7.59E-02
1.33E-03
7.96E-02
7.23E-02
7.59E-02
1.33E-03
7.96E-02
7.23E-02
7.28E-02
1.01E-03
7.55E-02
7.00E-02
1.50E-01
PASS
7.32E-02
1.02E-03
7.60E-02
7.04E-02
1.50E-01
PASS
7.36E-02
1.07E-03
7.65E-02
7.07E-02
1.50E-01
PASS
7.38E-02
1.10E-03
7.68E-02
7.08E-02
1.50E-01
PASS
7.43E-02
1.06E-03
7.72E-02
7.14E-02
1.50E-01
PASS
7.45E-02
1.00E-03
7.73E-02
7.18E-02
1.50E-01
PASS
7.45E-02
1.00E-03
7.73E-02
7.18E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
158
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.76. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
159
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.76. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.33E-02
7.42E-02
6.97E-02
7.55E-02
7.12E-02
7.26E-02
7.27E-02
6.91E-02
7.11E-02
7.27E-02
7.25E-02
10
7.40E-02
7.56E-02
7.09E-02
7.65E-02
7.22E-02
7.29E-02
7.31E-02
6.95E-02
7.14E-02
7.33E-02
7.25E-02
20
7.47E-02
7.62E-02
7.14E-02
7.73E-02
7.28E-02
7.34E-02
7.34E-02
7.00E-02
7.17E-02
7.37E-02
7.25E-02
30
7.55E-02
7.67E-02
7.18E-02
7.78E-02
7.35E-02
7.35E-02
7.36E-02
7.03E-02
7.21E-02
7.40E-02
7.25E-02
50
7.57E-02
7.70E-02
7.21E-02
7.84E-02
7.39E-02
7.41E-02
7.41E-02
7.07E-02
7.25E-02
7.44E-02
7.25E-02
60
7.67E-02
7.79E-02
7.29E-02
7.93E-02
7.43E-02
7.42E-02
7.42E-02
7.09E-02
7.28E-02
7.44E-02
7.23E-02
70
7.67E-02
7.79E-02
7.29E-02
7.93E-02
7.43E-02
7.42E-02
7.42E-02
7.09E-02
7.28E-02
7.44E-02
7.23E-02
7.28E-02
2.32E-03
7.91E-02
6.64E-02
7.39E-02
2.32E-03
8.02E-02
6.75E-02
7.45E-02
2.40E-03
8.11E-02
6.79E-02
7.51E-02
2.41E-03
8.17E-02
6.85E-02
7.54E-02
2.49E-03
8.22E-02
6.86E-02
7.62E-02
2.60E-03
8.34E-02
6.91E-02
7.62E-02
2.60E-03
8.34E-02
6.91E-02
7.16E-02
1.58E-03
7.60E-02
6.73E-02
1.50E-01
PASS
7.20E-02
1.60E-03
7.64E-02
6.76E-02
1.50E-01
PASS
7.24E-02
1.57E-03
7.67E-02
6.81E-02
1.50E-01
PASS
7.27E-02
1.53E-03
7.69E-02
6.85E-02
1.50E-01
PASS
7.31E-02
1.56E-03
7.74E-02
6.89E-02
1.50E-01
PASS
7.33E-02
1.48E-03
7.74E-02
6.93E-02
1.50E-01
PASS
7.33E-02
1.48E-03
7.74E-02
6.93E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
160
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.77. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
161
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.77. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.34E-02
7.43E-02
6.97E-02
7.55E-02
7.18E-02
7.26E-02
7.22E-02
6.92E-02
7.15E-02
7.28E-02
7.30E-02
10
7.41E-02
7.59E-02
7.09E-02
7.67E-02
7.26E-02
7.29E-02
7.25E-02
6.94E-02
7.18E-02
7.31E-02
7.26E-02
20
7.47E-02
7.62E-02
7.09E-02
7.74E-02
7.34E-02
7.33E-02
7.30E-02
6.98E-02
7.23E-02
7.34E-02
7.23E-02
30
7.54E-02
7.69E-02
7.18E-02
7.78E-02
7.38E-02
7.35E-02
7.35E-02
7.02E-02
7.25E-02
7.40E-02
7.27E-02
50
7.56E-02
7.73E-02
7.19E-02
7.83E-02
7.44E-02
7.38E-02
7.37E-02
7.06E-02
7.33E-02
7.44E-02
7.27E-02
60
7.65E-02
7.79E-02
7.27E-02
7.92E-02
7.50E-02
7.41E-02
7.39E-02
7.07E-02
7.31E-02
7.46E-02
7.27E-02
70
7.65E-02
7.79E-02
7.27E-02
7.92E-02
7.50E-02
7.41E-02
7.39E-02
7.07E-02
7.31E-02
7.46E-02
7.27E-02
7.29E-02
2.27E-03
7.92E-02
6.67E-02
7.40E-02
2.37E-03
8.05E-02
6.76E-02
7.45E-02
2.52E-03
8.14E-02
6.76E-02
7.51E-02
2.43E-03
8.18E-02
6.85E-02
7.55E-02
2.52E-03
8.24E-02
6.86E-02
7.63E-02
2.54E-03
8.32E-02
6.93E-02
7.63E-02
2.54E-03
8.32E-02
6.93E-02
7.17E-02
1.47E-03
7.57E-02
6.76E-02
1.50E-01
PASS
7.20E-02
1.48E-03
7.60E-02
6.79E-02
1.50E-01
PASS
7.24E-02
1.48E-03
7.64E-02
6.83E-02
1.50E-01
PASS
7.27E-02
1.52E-03
7.69E-02
6.86E-02
1.50E-01
PASS
7.32E-02
1.48E-03
7.72E-02
6.91E-02
1.50E-01
PASS
7.33E-02
1.54E-03
7.75E-02
6.90E-02
1.50E-01
PASS
7.33E-02
1.54E-03
7.75E-02
6.90E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
162
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.78. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
163
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.78. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.46E-02
7.22E-02
7.32E-02
7.19E-02
7.26E-02
7.38E-02
7.17E-02
7.31E-02
7.14E-02
7.40E-02
7.42E-02
10
7.52E-02
7.33E-02
7.44E-02
7.27E-02
7.37E-02
7.41E-02
7.21E-02
7.33E-02
7.18E-02
7.42E-02
7.40E-02
20
7.57E-02
7.39E-02
7.47E-02
7.31E-02
7.40E-02
7.47E-02
7.24E-02
7.38E-02
7.21E-02
7.46E-02
7.41E-02
30
7.64E-02
7.46E-02
7.56E-02
7.35E-02
7.46E-02
7.48E-02
7.26E-02
7.41E-02
7.24E-02
7.49E-02
7.39E-02
50
7.68E-02
7.47E-02
7.59E-02
7.38E-02
7.48E-02
7.53E-02
7.30E-02
7.45E-02
7.30E-02
7.54E-02
7.41E-02
60
7.76E-02
7.57E-02
7.64E-02
7.47E-02
7.55E-02
7.55E-02
7.35E-02
7.47E-02
7.28E-02
7.55E-02
7.40E-02
70
7.76E-02
7.57E-02
7.64E-02
7.47E-02
7.55E-02
7.55E-02
7.35E-02
7.47E-02
7.28E-02
7.55E-02
7.40E-02
7.29E-02
1.06E-03
7.58E-02
7.00E-02
7.39E-02
9.78E-04
7.66E-02
7.12E-02
7.43E-02
9.80E-04
7.70E-02
7.16E-02
7.49E-02
1.09E-03
7.79E-02
7.20E-02
7.52E-02
1.15E-03
7.83E-02
7.20E-02
7.60E-02
1.10E-03
7.90E-02
7.30E-02
7.60E-02
1.10E-03
7.90E-02
7.30E-02
7.28E-02
1.20E-03
7.61E-02
6.95E-02
1.50E-01
PASS
7.31E-02
1.12E-03
7.62E-02
7.00E-02
1.50E-01
PASS
7.35E-02
1.21E-03
7.68E-02
7.02E-02
1.50E-01
PASS
7.38E-02
1.19E-03
7.70E-02
7.05E-02
1.50E-01
PASS
7.42E-02
1.17E-03
7.74E-02
7.10E-02
1.50E-01
PASS
7.44E-02
1.22E-03
7.77E-02
7.11E-02
1.50E-01
PASS
7.44E-02
1.22E-03
7.77E-02
7.11E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
164
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.79. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
165
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.79. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.55E-01
3.48E-01
3.50E-01
3.43E-01
3.46E-01
3.52E-01
3.45E-01
3.50E-01
3.44E-01
3.54E-01
3.52E-01
10
3.55E-01
3.51E-01
3.53E-01
3.45E-01
3.48E-01
3.53E-01
3.46E-01
3.51E-01
3.45E-01
3.54E-01
3.51E-01
20
3.56E-01
3.53E-01
3.54E-01
3.46E-01
3.49E-01
3.54E-01
3.47E-01
3.52E-01
3.45E-01
3.55E-01
3.51E-01
30
3.58E-01
3.55E-01
3.57E-01
3.47E-01
3.51E-01
3.55E-01
3.47E-01
3.52E-01
3.47E-01
3.56E-01
3.52E-01
50
3.60E-01
3.56E-01
3.57E-01
3.48E-01
3.52E-01
3.57E-01
3.49E-01
3.54E-01
3.49E-01
3.58E-01
3.52E-01
60
3.62E-01
3.59E-01
3.61E-01
3.52E-01
3.55E-01
3.58E-01
3.50E-01
3.55E-01
3.49E-01
3.59E-01
3.51E-01
70
3.62E-01
3.59E-01
3.61E-01
3.52E-01
3.55E-01
3.58E-01
3.50E-01
3.55E-01
3.49E-01
3.59E-01
3.51E-01
3.48E-01
4.77E-03
3.61E-01
3.35E-01
3.50E-01
4.05E-03
3.61E-01
3.39E-01
3.52E-01
4.16E-03
3.63E-01
3.40E-01
3.54E-01
4.32E-03
3.65E-01
3.42E-01
3.55E-01
4.44E-03
3.67E-01
3.42E-01
3.58E-01
4.39E-03
3.70E-01
3.46E-01
3.58E-01
4.39E-03
3.70E-01
3.46E-01
3.49E-01
4.33E-03
3.61E-01
3.37E-01
8.00E-01
PASS
3.50E-01
4.33E-03
3.61E-01
3.38E-01
8.00E-01
PASS
3.51E-01
4.38E-03
3.63E-01
3.39E-01
8.00E-01
PASS
3.52E-01
4.34E-03
3.63E-01
3.40E-01
8.00E-01
PASS
3.53E-01
4.15E-03
3.65E-01
3.42E-01
8.00E-01
PASS
3.54E-01
4.35E-03
3.66E-01
3.42E-01
8.00E-01
PASS
3.54E-01
4.35E-03
3.66E-01
3.42E-01
8.00E-01
PASS
An ISO 9001:2000 Certified Company
166
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.80. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
167
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.80. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.50E-01
3.53E-01
3.38E-01
3.58E-01
3.41E-01
3.48E-01
3.46E-01
3.36E-01
3.43E-01
3.50E-01
3.49E-01
10
3.49E-01
3.58E-01
3.41E-01
3.61E-01
3.45E-01
3.48E-01
3.47E-01
3.36E-01
3.43E-01
3.50E-01
3.48E-01
20
3.50E-01
3.59E-01
3.42E-01
3.63E-01
3.46E-01
3.49E-01
3.48E-01
3.37E-01
3.44E-01
3.51E-01
3.47E-01
30
3.53E-01
3.62E-01
3.45E-01
3.65E-01
3.48E-01
3.51E-01
3.49E-01
3.38E-01
3.45E-01
3.52E-01
3.48E-01
50
3.54E-01
3.63E-01
3.45E-01
3.67E-01
3.50E-01
3.52E-01
3.50E-01
3.39E-01
3.47E-01
3.54E-01
3.48E-01
60
3.57E-01
3.66E-01
3.48E-01
3.70E-01
3.52E-01
3.53E-01
3.51E-01
3.40E-01
3.48E-01
3.55E-01
3.48E-01
70
3.57E-01
3.66E-01
3.48E-01
3.70E-01
3.52E-01
3.53E-01
3.51E-01
3.40E-01
3.48E-01
3.55E-01
3.48E-01
3.48E-01
8.10E-03
3.70E-01
3.26E-01
3.51E-01
8.46E-03
3.74E-01
3.28E-01
3.52E-01
8.81E-03
3.76E-01
3.28E-01
3.54E-01
8.81E-03
3.79E-01
3.30E-01
3.56E-01
9.22E-03
3.81E-01
3.30E-01
3.59E-01
9.24E-03
3.84E-01
3.33E-01
3.59E-01
9.24E-03
3.84E-01
3.33E-01
3.45E-01
5.44E-03
3.59E-01
3.30E-01
8.00E-01
PASS
3.45E-01
5.40E-03
3.60E-01
3.30E-01
8.00E-01
PASS
3.46E-01
5.56E-03
3.61E-01
3.31E-01
8.00E-01
PASS
3.47E-01
5.82E-03
3.63E-01
3.31E-01
8.00E-01
PASS
3.49E-01
5.65E-03
3.64E-01
3.33E-01
8.00E-01
PASS
3.50E-01
5.75E-03
3.65E-01
3.34E-01
8.00E-01
PASS
3.50E-01
5.75E-03
3.65E-01
3.34E-01
8.00E-01
PASS
An ISO 9001:2000 Certified Company
168
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.81. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
169
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.81. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.49E-01
3.54E-01
3.37E-01
3.57E-01
3.43E-01
3.47E-01
3.45E-01
3.36E-01
3.44E-01
3.50E-01
3.49E-01
10
3.49E-01
3.58E-01
3.40E-01
3.61E-01
3.46E-01
3.48E-01
3.46E-01
3.36E-01
3.44E-01
3.50E-01
3.48E-01
20
3.50E-01
3.60E-01
3.42E-01
3.63E-01
3.48E-01
3.49E-01
3.47E-01
3.37E-01
3.45E-01
3.51E-01
3.47E-01
30
3.52E-01
3.62E-01
3.43E-01
3.65E-01
3.50E-01
3.50E-01
3.48E-01
3.38E-01
3.47E-01
3.53E-01
3.48E-01
50
3.53E-01
3.63E-01
3.44E-01
3.67E-01
3.51E-01
3.51E-01
3.49E-01
3.39E-01
3.48E-01
3.54E-01
3.49E-01
60
3.57E-01
3.67E-01
3.47E-01
3.70E-01
3.53E-01
3.53E-01
3.50E-01
3.41E-01
3.49E-01
3.55E-01
3.48E-01
70
3.57E-01
3.67E-01
3.47E-01
3.70E-01
3.53E-01
3.53E-01
3.50E-01
3.41E-01
3.49E-01
3.55E-01
3.48E-01
3.48E-01
8.03E-03
3.70E-01
3.26E-01
3.51E-01
8.58E-03
3.74E-01
3.27E-01
3.52E-01
8.82E-03
3.77E-01
3.28E-01
3.55E-01
8.81E-03
3.79E-01
3.30E-01
3.56E-01
9.34E-03
3.81E-01
3.30E-01
3.59E-01
9.29E-03
3.84E-01
3.33E-01
3.59E-01
9.29E-03
3.84E-01
3.33E-01
3.44E-01
5.24E-03
3.59E-01
3.30E-01
8.00E-01
PASS
3.45E-01
5.28E-03
3.59E-01
3.30E-01
8.00E-01
PASS
3.46E-01
5.29E-03
3.60E-01
3.31E-01
8.00E-01
PASS
3.47E-01
5.74E-03
3.63E-01
3.31E-01
8.00E-01
PASS
3.48E-01
5.62E-03
3.64E-01
3.33E-01
8.00E-01
PASS
3.50E-01
5.44E-03
3.64E-01
3.35E-01
8.00E-01
PASS
3.50E-01
5.44E-03
3.64E-01
3.35E-01
8.00E-01
PASS
An ISO 9001:2000 Certified Company
170
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
9.00E-01
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.82. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
171
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.82. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.55E-01
3.47E-01
3.52E-01
3.43E-01
3.46E-01
3.51E-01
3.45E-01
3.51E-01
3.43E-01
3.54E-01
3.53E-01
10
3.54E-01
3.50E-01
3.55E-01
3.45E-01
3.49E-01
3.52E-01
3.45E-01
3.52E-01
3.44E-01
3.54E-01
3.52E-01
20
3.55E-01
3.52E-01
3.56E-01
3.46E-01
3.50E-01
3.54E-01
3.46E-01
3.53E-01
3.45E-01
3.56E-01
3.52E-01
30
3.57E-01
3.54E-01
3.59E-01
3.48E-01
3.52E-01
3.55E-01
3.47E-01
3.54E-01
3.46E-01
3.56E-01
3.53E-01
50
3.58E-01
3.55E-01
3.60E-01
3.49E-01
3.53E-01
3.56E-01
3.48E-01
3.55E-01
3.48E-01
3.58E-01
3.53E-01
60
3.61E-01
3.58E-01
3.62E-01
3.52E-01
3.56E-01
3.57E-01
3.49E-01
3.57E-01
3.49E-01
3.59E-01
3.53E-01
70
3.61E-01
3.58E-01
3.62E-01
3.52E-01
3.56E-01
3.57E-01
3.49E-01
3.57E-01
3.49E-01
3.59E-01
3.53E-01
3.48E-01
4.79E-03
3.62E-01
3.35E-01
3.51E-01
3.89E-03
3.61E-01
3.40E-01
3.52E-01
3.94E-03
3.63E-01
3.41E-01
3.54E-01
4.26E-03
3.66E-01
3.42E-01
3.55E-01
4.19E-03
3.66E-01
3.43E-01
3.58E-01
4.03E-03
3.69E-01
3.47E-01
3.58E-01
4.03E-03
3.69E-01
3.47E-01
3.49E-01
4.71E-03
3.62E-01
3.36E-01
8.00E-01
PASS
3.49E-01
4.66E-03
3.62E-01
3.37E-01
8.00E-01
PASS
3.51E-01
4.81E-03
3.64E-01
3.38E-01
8.00E-01
PASS
3.52E-01
4.69E-03
3.64E-01
3.39E-01
8.00E-01
PASS
3.53E-01
4.72E-03
3.66E-01
3.40E-01
8.00E-01
PASS
3.54E-01
4.79E-03
3.67E-01
3.41E-01
8.00E-01
PASS
3.54E-01
4.79E-03
3.67E-01
3.41E-01
8.00E-01
PASS
An ISO 9001:2000 Certified Company
172
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.83. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
173
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.83. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.99E-02
1.99E-02
1.96E-02
2.03E-02
1.98E-02
1.94E-02
1.94E-02
1.93E-02
2.02E-02
1.99E-02
1.99E-02
10
1.99E-02
2.04E-02
2.00E-02
2.07E-02
2.01E-02
1.96E-02
1.95E-02
1.95E-02
2.04E-02
2.00E-02
1.98E-02
20
1.98E-02
2.06E-02
2.02E-02
2.08E-02
2.04E-02
1.97E-02
1.96E-02
1.94E-02
2.03E-02
2.01E-02
1.97E-02
30
2.01E-02
2.07E-02
2.05E-02
2.08E-02
2.05E-02
1.98E-02
1.98E-02
1.95E-02
2.06E-02
2.02E-02
1.99E-02
50
2.02E-02
2.11E-02
2.07E-02
2.11E-02
2.06E-02
2.01E-02
2.01E-02
1.99E-02
2.07E-02
2.03E-02
1.97E-02
60
2.05E-02
2.12E-02
2.07E-02
2.15E-02
2.09E-02
2.01E-02
2.00E-02
2.00E-02
2.10E-02
2.06E-02
1.96E-02
70
2.05E-02
2.12E-02
2.07E-02
2.15E-02
2.09E-02
2.01E-02
2.00E-02
2.00E-02
2.10E-02
2.06E-02
1.96E-02
1.99E-02
2.57E-04
2.06E-02
1.92E-02
2.02E-02
3.44E-04
2.12E-02
1.93E-02
2.04E-02
3.61E-04
2.13E-02
1.94E-02
2.05E-02
2.52E-04
2.12E-02
1.98E-02
2.07E-02
3.60E-04
2.17E-02
1.97E-02
2.10E-02
3.97E-04
2.21E-02
1.99E-02
2.10E-02
3.97E-04
2.21E-02
1.99E-02
1.96E-02
3.96E-04
2.07E-02
1.85E-02
3.00E-02
PASS
1.98E-02
3.97E-04
2.09E-02
1.87E-02
6.00E-02
PASS
1.98E-02
3.50E-04
2.08E-02
1.89E-02
6.00E-02
PASS
2.00E-02
4.33E-04
2.12E-02
1.88E-02
6.00E-02
PASS
2.02E-02
2.88E-04
2.10E-02
1.94E-02
6.00E-02
PASS
2.03E-02
4.32E-04
2.15E-02
1.92E-02
6.00E-02
PASS
2.03E-02
4.32E-04
2.15E-02
1.92E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
174
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.84. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
175
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.84. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.11E-02
2.06E-02
2.07E-02
2.10E-02
2.07E-02
2.01E-02
2.07E-02
1.97E-02
2.02E-02
1.89E-02
2.03E-02
10
2.12E-02
2.10E-02
2.10E-02
2.14E-02
2.12E-02
2.03E-02
2.05E-02
1.99E-02
2.03E-02
1.89E-02
2.02E-02
20
2.14E-02
2.14E-02
2.11E-02
2.19E-02
2.15E-02
2.04E-02
2.06E-02
2.00E-02
2.05E-02
1.89E-02
2.02E-02
30
2.15E-02
2.15E-02
2.13E-02
2.19E-02
2.17E-02
2.04E-02
2.08E-02
2.00E-02
2.05E-02
1.90E-02
2.02E-02
50
2.17E-02
2.18E-02
2.15E-02
2.22E-02
2.19E-02
2.06E-02
2.09E-02
2.02E-02
2.10E-02
1.95E-02
2.02E-02
60
2.20E-02
2.19E-02
2.19E-02
2.22E-02
2.21E-02
2.09E-02
2.12E-02
2.03E-02
2.10E-02
1.94E-02
2.04E-02
70
2.20E-02
2.19E-02
2.19E-02
2.22E-02
2.21E-02
2.09E-02
2.12E-02
2.03E-02
2.10E-02
1.94E-02
2.04E-02
2.08E-02
2.10E-04
2.14E-02
2.03E-02
2.12E-02
1.84E-04
2.17E-02
2.07E-02
2.14E-02
2.91E-04
2.22E-02
2.06E-02
2.16E-02
2.12E-04
2.21E-02
2.10E-02
2.18E-02
2.44E-04
2.25E-02
2.11E-02
2.20E-02
1.39E-04
2.24E-02
2.17E-02
2.20E-02
1.39E-04
2.24E-02
2.17E-02
1.99E-02
6.74E-04
2.17E-02
1.80E-02
3.00E-02
PASS
2.00E-02
6.43E-04
2.17E-02
1.82E-02
6.00E-02
PASS
2.01E-02
7.08E-04
2.20E-02
1.81E-02
6.00E-02
PASS
2.02E-02
7.00E-04
2.21E-02
1.82E-02
6.00E-02
PASS
2.04E-02
5.94E-04
2.21E-02
1.88E-02
6.00E-02
PASS
2.06E-02
7.20E-04
2.25E-02
1.86E-02
6.00E-02
PASS
2.06E-02
7.20E-04
2.25E-02
1.86E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
176
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.85. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
177
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.85. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.06E-02
2.00E-02
2.03E-02
2.08E-02
2.08E-02
1.98E-02
2.01E-02
1.97E-02
2.03E-02
1.95E-02
1.99E-02
10
2.07E-02
2.05E-02
2.07E-02
2.13E-02
2.12E-02
1.97E-02
2.02E-02
2.00E-02
2.03E-02
1.97E-02
1.96E-02
20
2.09E-02
2.06E-02
2.08E-02
2.16E-02
2.13E-02
2.01E-02
2.04E-02
2.00E-02
2.04E-02
1.96E-02
1.97E-02
30
2.10E-02
2.10E-02
2.11E-02
2.18E-02
2.16E-02
2.01E-02
2.06E-02
2.00E-02
2.07E-02
1.98E-02
1.98E-02
50
2.12E-02
2.10E-02
2.12E-02
2.20E-02
2.18E-02
2.02E-02
2.06E-02
2.03E-02
2.10E-02
2.00E-02
1.98E-02
60
2.15E-02
2.13E-02
2.16E-02
2.22E-02
2.22E-02
2.04E-02
2.08E-02
2.06E-02
2.10E-02
2.01E-02
1.98E-02
70
2.15E-02
2.13E-02
2.16E-02
2.22E-02
2.22E-02
2.04E-02
2.08E-02
2.06E-02
2.10E-02
2.01E-02
1.98E-02
2.05E-02
3.34E-04
2.14E-02
1.96E-02
2.09E-02
3.48E-04
2.18E-02
1.99E-02
2.10E-02
3.99E-04
2.21E-02
1.99E-02
2.13E-02
3.90E-04
2.24E-02
2.02E-02
2.14E-02
4.24E-04
2.26E-02
2.03E-02
2.18E-02
4.00E-04
2.29E-02
2.07E-02
2.18E-02
4.00E-04
2.29E-02
2.07E-02
1.99E-02
3.08E-04
2.07E-02
1.90E-02
3.00E-02
PASS
2.00E-02
2.85E-04
2.08E-02
1.92E-02
6.00E-02
PASS
2.01E-02
3.48E-04
2.10E-02
1.91E-02
6.00E-02
PASS
2.02E-02
3.93E-04
2.13E-02
1.92E-02
6.00E-02
PASS
2.04E-02
3.72E-04
2.14E-02
1.94E-02
6.00E-02
PASS
2.06E-02
3.81E-04
2.16E-02
1.95E-02
6.00E-02
PASS
2.06E-02
3.81E-04
2.16E-02
1.95E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
178
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.86. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
179
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.86. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.00E-02
2.01E-02
2.03E-02
2.07E-02
2.01E-02
1.97E-02
1.95E-02
1.97E-02
2.07E-02
2.02E-02
2.03E-02
10
2.01E-02
2.06E-02
2.07E-02
2.12E-02
2.06E-02
1.98E-02
1.97E-02
1.98E-02
2.06E-02
2.02E-02
2.01E-02
20
2.02E-02
2.08E-02
2.09E-02
2.11E-02
2.06E-02
2.01E-02
2.00E-02
1.99E-02
2.09E-02
2.03E-02
2.01E-02
30
2.06E-02
2.10E-02
2.11E-02
2.14E-02
2.07E-02
2.02E-02
1.99E-02
2.00E-02
2.11E-02
2.05E-02
2.01E-02
50
2.07E-02
2.11E-02
2.12E-02
2.15E-02
2.10E-02
2.03E-02
2.01E-02
2.02E-02
2.13E-02
2.07E-02
2.01E-02
60
2.09E-02
2.14E-02
2.14E-02
2.18E-02
2.14E-02
2.04E-02
2.03E-02
2.04E-02
2.13E-02
2.07E-02
2.01E-02
70
2.09E-02
2.14E-02
2.14E-02
2.18E-02
2.14E-02
2.04E-02
2.03E-02
2.04E-02
2.13E-02
2.07E-02
2.01E-02
2.02E-02
2.77E-04
2.10E-02
1.95E-02
2.06E-02
3.92E-04
2.17E-02
1.95E-02
2.07E-02
3.57E-04
2.17E-02
1.97E-02
2.09E-02
3.27E-04
2.18E-02
2.00E-02
2.11E-02
2.79E-04
2.19E-02
2.03E-02
2.14E-02
3.16E-04
2.23E-02
2.05E-02
2.14E-02
3.16E-04
2.23E-02
2.05E-02
2.00E-02
4.75E-04
2.13E-02
1.86E-02
3.00E-02
PASS
2.00E-02
4.03E-04
2.11E-02
1.89E-02
6.00E-02
PASS
2.02E-02
4.12E-04
2.14E-02
1.91E-02
6.00E-02
PASS
2.03E-02
4.78E-04
2.16E-02
1.90E-02
6.00E-02
PASS
2.05E-02
4.89E-04
2.18E-02
1.92E-02
6.00E-02
PASS
2.06E-02
4.10E-04
2.18E-02
1.95E-02
6.00E-02
PASS
2.06E-02
4.10E-04
2.18E-02
1.95E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
180
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.87. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
181
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.87. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.47E-02
5.50E-02
5.48E-02
5.46E-02
5.43E-02
5.43E-02
5.38E-02
5.42E-02
5.47E-02
5.51E-02
5.43E-02
10
5.44E-02
5.55E-02
5.52E-02
5.50E-02
5.46E-02
5.42E-02
5.38E-02
5.42E-02
5.46E-02
5.49E-02
5.41E-02
20
5.46E-02
5.58E-02
5.54E-02
5.51E-02
5.50E-02
5.42E-02
5.38E-02
5.42E-02
5.49E-02
5.51E-02
5.40E-02
30
5.49E-02
5.59E-02
5.58E-02
5.54E-02
5.51E-02
5.44E-02
5.40E-02
5.45E-02
5.51E-02
5.54E-02
5.41E-02
50
5.52E-02
5.62E-02
5.59E-02
5.54E-02
5.54E-02
5.47E-02
5.43E-02
5.45E-02
5.52E-02
5.55E-02
5.42E-02
60
5.55E-02
5.66E-02
5.64E-02
5.61E-02
5.58E-02
5.49E-02
5.46E-02
5.47E-02
5.54E-02
5.57E-02
5.41E-02
70
5.55E-02
5.66E-02
5.64E-02
5.61E-02
5.58E-02
5.49E-02
5.46E-02
5.47E-02
5.54E-02
5.57E-02
5.41E-02
5.47E-02
2.73E-04
5.54E-02
5.39E-02
5.49E-02
4.38E-04
5.61E-02
5.37E-02
5.52E-02
4.18E-04
5.63E-02
5.40E-02
5.54E-02
4.46E-04
5.66E-02
5.42E-02
5.56E-02
4.23E-04
5.68E-02
5.44E-02
5.61E-02
4.23E-04
5.73E-02
5.49E-02
5.61E-02
4.23E-04
5.73E-02
5.49E-02
5.44E-02
5.00E-04
5.58E-02
5.31E-02
1.00E-01
PASS
5.43E-02
4.14E-04
5.55E-02
5.32E-02
1.00E-01
PASS
5.44E-02
5.39E-04
5.59E-02
5.30E-02
1.00E-01
PASS
5.47E-02
5.46E-04
5.61E-02
5.32E-02
1.00E-01
PASS
5.48E-02
4.81E-04
5.62E-02
5.35E-02
1.00E-01
PASS
5.51E-02
4.75E-04
5.64E-02
5.38E-02
1.00E-01
PASS
5.51E-02
4.75E-04
5.64E-02
5.38E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
182
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.88. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
183
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.88. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.62E-02
5.56E-02
5.46E-02
5.67E-02
5.54E-02
5.54E-02
5.49E-02
5.37E-02
5.46E-02
5.39E-02
5.54E-02
10
5.59E-02
5.60E-02
5.50E-02
5.71E-02
5.60E-02
5.52E-02
5.51E-02
5.35E-02
5.48E-02
5.39E-02
5.50E-02
20
5.63E-02
5.64E-02
5.55E-02
5.75E-02
5.60E-02
5.54E-02
5.52E-02
5.38E-02
5.47E-02
5.40E-02
5.50E-02
30
5.65E-02
5.67E-02
5.58E-02
5.77E-02
5.66E-02
5.56E-02
5.53E-02
5.38E-02
5.51E-02
5.41E-02
5.51E-02
50
5.66E-02
5.68E-02
5.58E-02
5.79E-02
5.67E-02
5.58E-02
5.55E-02
5.40E-02
5.53E-02
5.45E-02
5.53E-02
60
5.75E-02
5.75E-02
5.63E-02
5.85E-02
5.73E-02
5.60E-02
5.57E-02
5.43E-02
5.54E-02
5.44E-02
5.53E-02
70
5.75E-02
5.75E-02
5.63E-02
5.85E-02
5.73E-02
5.60E-02
5.57E-02
5.43E-02
5.54E-02
5.44E-02
5.53E-02
5.57E-02
7.97E-04
5.79E-02
5.35E-02
5.60E-02
7.27E-04
5.80E-02
5.40E-02
5.63E-02
7.30E-04
5.83E-02
5.43E-02
5.66E-02
6.91E-04
5.85E-02
5.47E-02
5.68E-02
7.59E-04
5.89E-02
5.47E-02
5.74E-02
7.82E-04
5.96E-02
5.53E-02
5.74E-02
7.82E-04
5.96E-02
5.53E-02
5.45E-02
7.04E-04
5.64E-02
5.26E-02
1.00E-01
PASS
5.45E-02
7.59E-04
5.66E-02
5.24E-02
1.00E-01
PASS
5.46E-02
7.16E-04
5.66E-02
5.27E-02
1.00E-01
PASS
5.48E-02
7.48E-04
5.68E-02
5.27E-02
1.00E-01
PASS
5.50E-02
7.31E-04
5.70E-02
5.30E-02
1.00E-01
PASS
5.52E-02
7.62E-04
5.73E-02
5.31E-02
1.00E-01
PASS
5.52E-02
7.62E-04
5.73E-02
5.31E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
184
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.89. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
185
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.89. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.56E-02
5.45E-02
5.42E-02
5.61E-02
5.50E-02
5.46E-02
5.45E-02
5.32E-02
5.44E-02
5.40E-02
5.46E-02
10
5.55E-02
5.53E-02
5.46E-02
5.65E-02
5.55E-02
5.46E-02
5.46E-02
5.32E-02
5.46E-02
5.39E-02
5.44E-02
20
5.58E-02
5.55E-02
5.48E-02
5.68E-02
5.57E-02
5.47E-02
5.44E-02
5.35E-02
5.46E-02
5.43E-02
5.42E-02
30
5.61E-02
5.59E-02
5.50E-02
5.71E-02
5.61E-02
5.47E-02
5.47E-02
5.36E-02
5.50E-02
5.42E-02
5.43E-02
50
5.61E-02
5.62E-02
5.52E-02
5.73E-02
5.64E-02
5.49E-02
5.48E-02
5.37E-02
5.51E-02
5.47E-02
5.45E-02
60
5.66E-02
5.65E-02
5.59E-02
5.79E-02
5.69E-02
5.51E-02
5.52E-02
5.41E-02
5.52E-02
5.47E-02
5.43E-02
70
5.66E-02
5.65E-02
5.59E-02
5.79E-02
5.69E-02
5.51E-02
5.52E-02
5.41E-02
5.52E-02
5.47E-02
5.43E-02
5.51E-02
7.89E-04
5.72E-02
5.29E-02
5.55E-02
6.98E-04
5.74E-02
5.36E-02
5.57E-02
6.92E-04
5.76E-02
5.38E-02
5.60E-02
7.53E-04
5.81E-02
5.40E-02
5.62E-02
7.42E-04
5.83E-02
5.42E-02
5.68E-02
7.21E-04
5.87E-02
5.48E-02
5.68E-02
7.21E-04
5.87E-02
5.48E-02
5.42E-02
5.61E-04
5.57E-02
5.26E-02
1.00E-01
PASS
5.42E-02
6.14E-04
5.59E-02
5.25E-02
1.00E-01
PASS
5.43E-02
4.52E-04
5.55E-02
5.31E-02
1.00E-01
PASS
5.45E-02
5.76E-04
5.60E-02
5.29E-02
1.00E-01
PASS
5.46E-02
5.20E-04
5.61E-02
5.32E-02
1.00E-01
PASS
5.48E-02
4.80E-04
5.62E-02
5.35E-02
1.00E-01
PASS
5.48E-02
4.80E-04
5.62E-02
5.35E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
186
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.90. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
187
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.90. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.53E-02
5.53E-02
5.54E-02
5.52E-02
5.46E-02
5.47E-02
5.41E-02
5.47E-02
5.56E-02
5.55E-02
5.49E-02
10
5.50E-02
5.59E-02
5.60E-02
5.56E-02
5.51E-02
5.48E-02
5.42E-02
5.48E-02
5.55E-02
5.53E-02
5.46E-02
20
5.51E-02
5.58E-02
5.62E-02
5.59E-02
5.53E-02
5.50E-02
5.42E-02
5.49E-02
5.54E-02
5.56E-02
5.45E-02
30
5.55E-02
5.64E-02
5.66E-02
5.62E-02
5.56E-02
5.50E-02
5.45E-02
5.48E-02
5.57E-02
5.55E-02
5.47E-02
50
5.57E-02
5.65E-02
5.68E-02
5.63E-02
5.58E-02
5.51E-02
5.47E-02
5.53E-02
5.60E-02
5.58E-02
5.48E-02
60
5.63E-02
5.71E-02
5.72E-02
5.68E-02
5.63E-02
5.55E-02
5.48E-02
5.53E-02
5.61E-02
5.60E-02
5.46E-02
70
5.63E-02
5.71E-02
5.72E-02
5.68E-02
5.63E-02
5.55E-02
5.48E-02
5.53E-02
5.61E-02
5.60E-02
5.46E-02
5.52E-02
3.33E-04
5.61E-02
5.43E-02
5.55E-02
4.50E-04
5.67E-02
5.43E-02
5.57E-02
4.68E-04
5.69E-02
5.44E-02
5.60E-02
5.04E-04
5.74E-02
5.47E-02
5.62E-02
4.60E-04
5.75E-02
5.50E-02
5.67E-02
4.55E-04
5.80E-02
5.55E-02
5.67E-02
4.55E-04
5.80E-02
5.55E-02
5.49E-02
6.09E-04
5.66E-02
5.32E-02
1.00E-01
PASS
5.49E-02
5.18E-04
5.63E-02
5.35E-02
1.00E-01
PASS
5.50E-02
5.13E-04
5.64E-02
5.36E-02
1.00E-01
PASS
5.51E-02
4.88E-04
5.64E-02
5.38E-02
1.00E-01
PASS
5.54E-02
5.37E-04
5.68E-02
5.39E-02
1.00E-01
PASS
5.56E-02
5.28E-04
5.70E-02
5.41E-02
1.00E-01
PASS
5.56E-02
5.28E-04
5.70E-02
5.41E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
188
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.91. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
189
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.91. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.19E-01
2.20E-01
2.20E-01
2.16E-01
2.16E-01
2.17E-01
2.17E-01
2.20E-01
2.16E-01
2.21E-01
2.16E-01
10
2.17E-01
2.21E-01
2.21E-01
2.16E-01
2.16E-01
2.17E-01
2.16E-01
2.20E-01
2.16E-01
2.21E-01
2.15E-01
20
2.17E-01
2.21E-01
2.21E-01
2.16E-01
2.16E-01
2.17E-01
2.16E-01
2.20E-01
2.16E-01
2.21E-01
2.15E-01
30
2.18E-01
2.22E-01
2.22E-01
2.16E-01
2.17E-01
2.17E-01
2.16E-01
2.20E-01
2.16E-01
2.21E-01
2.16E-01
50
2.18E-01
2.22E-01
2.22E-01
2.16E-01
2.17E-01
2.17E-01
2.17E-01
2.20E-01
2.16E-01
2.22E-01
2.15E-01
60
2.20E-01
2.24E-01
2.24E-01
2.19E-01
2.19E-01
2.18E-01
2.18E-01
2.22E-01
2.17E-01
2.22E-01
2.15E-01
70
2.20E-01
2.24E-01
2.24E-01
2.19E-01
2.19E-01
2.18E-01
2.18E-01
2.22E-01
2.17E-01
2.22E-01
2.15E-01
2.18E-01
2.30E-03
2.24E-01
2.12E-01
2.18E-01
2.65E-03
2.26E-01
2.11E-01
2.18E-01
2.70E-03
2.26E-01
2.11E-01
2.19E-01
2.78E-03
2.27E-01
2.12E-01
2.19E-01
2.67E-03
2.26E-01
2.12E-01
2.21E-01
2.43E-03
2.28E-01
2.15E-01
2.21E-01
2.43E-03
2.28E-01
2.15E-01
2.18E-01
2.38E-03
2.25E-01
2.12E-01
5.00E-01
PASS
2.18E-01
2.36E-03
2.24E-01
2.11E-01
5.00E-01
PASS
2.18E-01
2.42E-03
2.25E-01
2.11E-01
5.00E-01
PASS
2.18E-01
2.40E-03
2.25E-01
2.12E-01
5.00E-01
PASS
2.18E-01
2.46E-03
2.25E-01
2.12E-01
5.00E-01
PASS
2.19E-01
2.39E-03
2.26E-01
2.13E-01
5.00E-01
PASS
2.19E-01
2.39E-03
2.26E-01
2.13E-01
5.00E-01
PASS
An ISO 9001:2000 Certified Company
190
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.92. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
191
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.92. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.21E-01
2.20E-01
2.17E-01
2.20E-01
2.17E-01
2.22E-01
2.18E-01
2.16E-01
2.18E-01
2.19E-01
2.21E-01
10
2.19E-01
2.21E-01
2.18E-01
2.20E-01
2.18E-01
2.21E-01
2.17E-01
2.16E-01
2.17E-01
2.19E-01
2.19E-01
20
2.19E-01
2.21E-01
2.18E-01
2.21E-01
2.19E-01
2.22E-01
2.17E-01
2.16E-01
2.17E-01
2.19E-01
2.19E-01
30
2.20E-01
2.22E-01
2.19E-01
2.22E-01
2.19E-01
2.22E-01
2.18E-01
2.16E-01
2.17E-01
2.19E-01
2.20E-01
50
2.20E-01
2.21E-01
2.19E-01
2.22E-01
2.19E-01
2.22E-01
2.18E-01
2.16E-01
2.18E-01
2.19E-01
2.20E-01
60
2.22E-01
2.24E-01
2.21E-01
2.24E-01
2.21E-01
2.23E-01
2.19E-01
2.18E-01
2.18E-01
2.20E-01
2.20E-01
70
2.22E-01
2.24E-01
2.21E-01
2.24E-01
2.21E-01
2.23E-01
2.19E-01
2.18E-01
2.18E-01
2.20E-01
2.20E-01
2.19E-01
1.60E-03
2.23E-01
2.15E-01
2.19E-01
1.36E-03
2.23E-01
2.16E-01
2.19E-01
1.33E-03
2.23E-01
2.16E-01
2.20E-01
1.47E-03
2.24E-01
2.16E-01
2.20E-01
1.33E-03
2.24E-01
2.16E-01
2.22E-01
1.44E-03
2.26E-01
2.18E-01
2.22E-01
1.44E-03
2.26E-01
2.18E-01
2.19E-01
2.24E-03
2.25E-01
2.13E-01
5.00E-01
PASS
2.18E-01
2.10E-03
2.24E-01
2.12E-01
5.00E-01
PASS
2.18E-01
2.38E-03
2.25E-01
2.12E-01
5.00E-01
PASS
2.18E-01
2.20E-03
2.24E-01
2.12E-01
5.00E-01
PASS
2.19E-01
2.15E-03
2.25E-01
2.13E-01
5.00E-01
PASS
2.20E-01
2.14E-03
2.25E-01
2.14E-01
5.00E-01
PASS
2.20E-01
2.14E-03
2.25E-01
2.14E-01
5.00E-01
PASS
An ISO 9001:2000 Certified Company
192
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.93. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
193
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.93. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.19E-01
2.17E-01
2.15E-01
2.18E-01
2.15E-01
2.19E-01
2.16E-01
2.14E-01
2.16E-01
2.17E-01
2.18E-01
10
2.16E-01
2.18E-01
2.16E-01
2.18E-01
2.16E-01
2.19E-01
2.15E-01
2.14E-01
2.15E-01
2.16E-01
2.16E-01
20
2.17E-01
2.18E-01
2.16E-01
2.18E-01
2.16E-01
2.19E-01
2.15E-01
2.14E-01
2.15E-01
2.17E-01
2.17E-01
30
2.18E-01
2.19E-01
2.17E-01
2.19E-01
2.17E-01
2.19E-01
2.16E-01
2.14E-01
2.16E-01
2.17E-01
2.17E-01
50
2.18E-01
2.19E-01
2.17E-01
2.19E-01
2.16E-01
2.19E-01
2.16E-01
2.15E-01
2.15E-01
2.17E-01
2.17E-01
60
2.20E-01
2.22E-01
2.19E-01
2.22E-01
2.19E-01
2.20E-01
2.16E-01
2.16E-01
2.16E-01
2.18E-01
2.17E-01
70
2.20E-01
2.22E-01
2.19E-01
2.22E-01
2.19E-01
2.20E-01
2.16E-01
2.16E-01
2.16E-01
2.18E-01
2.17E-01
2.17E-01
1.47E-03
2.21E-01
2.13E-01
2.17E-01
1.22E-03
2.20E-01
2.13E-01
2.17E-01
1.28E-03
2.21E-01
2.14E-01
2.18E-01
1.32E-03
2.22E-01
2.14E-01
2.18E-01
1.25E-03
2.21E-01
2.14E-01
2.20E-01
1.47E-03
2.24E-01
2.16E-01
2.20E-01
1.47E-03
2.24E-01
2.16E-01
2.16E-01
1.76E-03
2.21E-01
2.11E-01
5.00E-01
PASS
2.16E-01
1.72E-03
2.20E-01
2.11E-01
5.00E-01
PASS
2.16E-01
1.79E-03
2.21E-01
2.11E-01
5.00E-01
PASS
2.16E-01
1.63E-03
2.21E-01
2.12E-01
5.00E-01
PASS
2.17E-01
1.65E-03
2.21E-01
2.12E-01
5.00E-01
PASS
2.17E-01
1.86E-03
2.22E-01
2.12E-01
5.00E-01
PASS
2.17E-01
1.86E-03
2.22E-01
2.12E-01
5.00E-01
PASS
An ISO 9001:2000 Certified Company
194
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.94. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
195
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.94. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.22E-01
2.22E-01
2.23E-01
2.18E-01
2.18E-01
2.20E-01
2.19E-01
2.23E-01
2.19E-01
2.23E-01
2.19E-01
10
2.20E-01
2.23E-01
2.23E-01
2.19E-01
2.19E-01
2.20E-01
2.18E-01
2.23E-01
2.18E-01
2.23E-01
2.18E-01
20
2.20E-01
2.24E-01
2.23E-01
2.19E-01
2.19E-01
2.20E-01
2.18E-01
2.22E-01
2.18E-01
2.23E-01
2.18E-01
30
2.21E-01
2.24E-01
2.25E-01
2.19E-01
2.19E-01
2.20E-01
2.19E-01
2.23E-01
2.19E-01
2.23E-01
2.18E-01
50
2.21E-01
2.25E-01
2.24E-01
2.19E-01
2.19E-01
2.20E-01
2.19E-01
2.23E-01
2.19E-01
2.23E-01
2.18E-01
60
2.23E-01
2.26E-01
2.26E-01
2.22E-01
2.22E-01
2.21E-01
2.20E-01
2.24E-01
2.20E-01
2.24E-01
2.18E-01
70
2.23E-01
2.26E-01
2.26E-01
2.22E-01
2.22E-01
2.21E-01
2.20E-01
2.24E-01
2.20E-01
2.24E-01
2.18E-01
2.21E-01
2.44E-03
2.27E-01
2.14E-01
2.21E-01
2.41E-03
2.27E-01
2.14E-01
2.21E-01
2.41E-03
2.28E-01
2.14E-01
2.22E-01
2.65E-03
2.29E-01
2.14E-01
2.22E-01
2.66E-03
2.29E-01
2.14E-01
2.24E-01
2.33E-03
2.30E-01
2.17E-01
2.24E-01
2.33E-03
2.30E-01
2.17E-01
2.21E-01
2.13E-03
2.27E-01
2.15E-01
5.00E-01
PASS
2.20E-01
2.34E-03
2.27E-01
2.14E-01
5.00E-01
PASS
2.20E-01
2.19E-03
2.26E-01
2.14E-01
5.00E-01
PASS
2.21E-01
2.09E-03
2.26E-01
2.15E-01
5.00E-01
PASS
2.21E-01
2.10E-03
2.27E-01
2.15E-01
5.00E-01
PASS
2.22E-01
2.28E-03
2.28E-01
2.15E-01
5.00E-01
PASS
2.22E-01
2.28E-03
2.28E-01
2.15E-01
5.00E-01
PASS
An ISO 9001:2000 Certified Company
196
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @ +/- 15 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.95. Plot of Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
197
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.95. Raw data for Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ +/- 15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.56E-02
-3.78E-02
-3.81E-02
-3.52E-02
-3.53E-02
-3.48E-02
-3.70E-02
-3.93E-02
-3.57E-02
-3.72E-02
-3.57E-02
10
-3.37E-02
-3.67E-02
-3.70E-02
-3.41E-02
-3.42E-02
-3.40E-02
-3.61E-02
-3.85E-02
-3.47E-02
-3.63E-02
-3.53E-02
20
-3.31E-02
-3.62E-02
-3.65E-02
-3.37E-02
-3.38E-02
-3.37E-02
-3.57E-02
-3.81E-02
-3.43E-02
-3.60E-02
-3.53E-02
30
-3.29E-02
-3.60E-02
-3.64E-02
-3.35E-02
-3.36E-02
-3.34E-02
-3.54E-02
-3.78E-02
-3.40E-02
-3.57E-02
-3.54E-02
50
-3.20E-02
-3.52E-02
-3.56E-02
-3.27E-02
-3.28E-02
-3.28E-02
-3.49E-02
-3.73E-02
-3.34E-02
-3.52E-02
-3.55E-02
60
-3.28E-02
-3.59E-02
-3.62E-02
-3.35E-02
-3.35E-02
-3.32E-02
-3.53E-02
-3.77E-02
-3.37E-02
-3.55E-02
-3.54E-02
70
-3.28E-02
-3.59E-02
-3.62E-02
-3.35E-02
-3.35E-02
-3.32E-02
-3.53E-02
-3.77E-02
-3.37E-02
-3.55E-02
-3.54E-02
-3.64E-02
1.43E-03
-3.25E-02
-4.03E-02
-3.51E-02
1.57E-03
-3.08E-02
-3.94E-02
-3.46E-02
1.57E-03
-3.03E-02
-3.90E-02
-3.45E-02
1.61E-03
-3.01E-02
-3.89E-02
-3.36E-02
1.62E-03
-2.92E-02
-3.81E-02
-3.44E-02
1.58E-03
-3.01E-02
-3.87E-02
-3.44E-02
1.58E-03
-3.01E-02
-3.87E-02
-3.68E-02
1.71E-03
-3.21E-02
-4.15E-02
-1.50E-02
PASS
-3.59E-02
1.71E-03
-3.12E-02
-4.06E-02
-1.00E-02
PASS
-3.55E-02
1.71E-03
-3.09E-02
-4.02E-02
-1.00E-02
PASS
-3.53E-02
1.71E-03
-3.06E-02
-4.00E-02
-1.00E-02
PASS
-3.47E-02
1.74E-03
-3.00E-02
-3.95E-02
-1.00E-02
PASS
-3.51E-02
1.74E-03
-3.03E-02
-3.98E-02
-1.00E-02
PASS
-3.51E-02
1.74E-03
-3.03E-02
-3.98E-02
-1.00E-02
PASS
An ISO 9001:2000 Certified Company
198
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @ +/- 15 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.96. Plot of Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
199
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.96. Raw data for Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ +/- 15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.52E-02
-3.57E-02
-3.87E-02
-3.21E-02
-3.55E-02
-3.82E-02
-3.49E-02
-4.00E-02
-3.71E-02
-3.84E-02
-3.76E-02
10
-3.33E-02
-3.46E-02
-3.75E-02
-3.08E-02
-3.43E-02
-3.75E-02
-3.40E-02
-3.91E-02
-3.60E-02
-3.74E-02
-3.72E-02
20
-3.27E-02
-3.40E-02
-3.70E-02
-3.02E-02
-3.37E-02
-3.71E-02
-3.36E-02
-3.87E-02
-3.56E-02
-3.70E-02
-3.72E-02
30
-3.25E-02
-3.39E-02
-3.69E-02
-3.00E-02
-3.34E-02
-3.69E-02
-3.34E-02
-3.84E-02
-3.53E-02
-3.67E-02
-3.73E-02
50
-3.15E-02
-3.30E-02
-3.61E-02
-2.91E-02
-3.26E-02
-3.63E-02
-3.29E-02
-3.79E-02
-3.48E-02
-3.62E-02
-3.74E-02
60
-3.23E-02
-3.38E-02
-3.67E-02
-2.99E-02
-3.33E-02
-3.67E-02
-3.32E-02
-3.82E-02
-3.51E-02
-3.65E-02
-3.73E-02
70
-3.23E-02
-3.38E-02
-3.67E-02
-2.99E-02
-3.33E-02
-3.67E-02
-3.32E-02
-3.82E-02
-3.51E-02
-3.65E-02
-3.73E-02
-3.54E-02
2.35E-03
-2.90E-02
-4.19E-02
-3.41E-02
2.44E-03
-2.74E-02
-4.08E-02
-3.35E-02
2.45E-03
-2.68E-02
-4.03E-02
-3.33E-02
2.50E-03
-2.64E-02
-4.02E-02
-3.24E-02
2.53E-03
-2.55E-02
-3.94E-02
-3.32E-02
2.48E-03
-2.64E-02
-4.00E-02
-3.32E-02
2.48E-03
-2.64E-02
-4.00E-02
-3.77E-02
1.91E-03
-3.25E-02
-4.29E-02
-1.50E-02
PASS
-3.68E-02
1.90E-03
-3.16E-02
-4.20E-02
-1.00E-02
PASS
-3.64E-02
1.90E-03
-3.12E-02
-4.16E-02
-1.00E-02
PASS
-3.61E-02
1.88E-03
-3.10E-02
-4.13E-02
-1.00E-02
PASS
-3.56E-02
1.87E-03
-3.04E-02
-4.07E-02
-1.00E-02
PASS
-3.59E-02
1.88E-03
-3.08E-02
-4.11E-02
-1.00E-02
PASS
-3.59E-02
1.88E-03
-3.08E-02
-4.11E-02
-1.00E-02
PASS
An ISO 9001:2000 Certified Company
200
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @ +/- 15 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
-4.50E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.97. Plot of Positive Short-Circuit Current @ +/- 15 V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
201
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.97. Raw data for Positive Short-Circuit Current @ +/- 15 V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ +/- 15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.57E-02
-3.60E-02
-3.96E-02
-3.23E-02
-3.51E-02
-3.92E-02
-3.59E-02
-4.04E-02
-3.70E-02
-3.87E-02
-3.79E-02
10
-3.37E-02
-3.48E-02
-3.84E-02
-3.10E-02
-3.39E-02
-3.83E-02
-3.51E-02
-3.95E-02
-3.60E-02
-3.78E-02
-3.76E-02
20
-3.31E-02
-3.43E-02
-3.79E-02
-3.05E-02
-3.33E-02
-3.80E-02
-3.47E-02
-3.91E-02
-3.55E-02
-3.74E-02
-3.75E-02
30
-3.29E-02
-3.41E-02
-3.77E-02
-3.02E-02
-3.31E-02
-3.77E-02
-3.44E-02
-3.88E-02
-3.53E-02
-3.71E-02
-3.77E-02
50
-3.19E-02
-3.32E-02
-3.69E-02
-2.93E-02
-3.22E-02
-3.71E-02
-3.39E-02
-3.82E-02
-3.47E-02
-3.65E-02
-3.77E-02
60
-3.27E-02
-3.40E-02
-3.76E-02
-3.01E-02
-3.29E-02
-3.75E-02
-3.43E-02
-3.86E-02
-3.50E-02
-3.69E-02
-3.77E-02
70
-3.27E-02
-3.40E-02
-3.76E-02
-3.01E-02
-3.29E-02
-3.75E-02
-3.43E-02
-3.86E-02
-3.50E-02
-3.69E-02
-3.77E-02
-3.57E-02
2.59E-03
-2.86E-02
-4.28E-02
-3.44E-02
2.66E-03
-2.71E-02
-4.16E-02
-3.38E-02
2.67E-03
-2.65E-02
-4.11E-02
-3.36E-02
2.73E-03
-2.61E-02
-4.11E-02
-3.27E-02
2.74E-03
-2.52E-02
-4.02E-02
-3.35E-02
2.70E-03
-2.60E-02
-4.09E-02
-3.35E-02
2.70E-03
-2.60E-02
-4.09E-02
-3.83E-02
1.78E-03
-3.34E-02
-4.31E-02
-1.50E-02
PASS
-3.73E-02
1.79E-03
-3.24E-02
-4.22E-02
-1.00E-02
PASS
-3.69E-02
1.80E-03
-3.20E-02
-4.19E-02
-1.00E-02
PASS
-3.67E-02
1.78E-03
-3.18E-02
-4.15E-02
-1.00E-02
PASS
-3.61E-02
1.77E-03
-3.12E-02
-4.09E-02
-1.00E-02
PASS
-3.65E-02
1.80E-03
-3.15E-02
-4.14E-02
-1.00E-02
PASS
-3.65E-02
1.80E-03
-3.15E-02
-4.14E-02
-1.00E-02
PASS
An ISO 9001:2000 Certified Company
202
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Short-Circuit Current @ +/- 15 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
-3.50E-02
-4.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.98. Plot of Positive Short-Circuit Current @ +/- 15 V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
203
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.98. Raw data for Positive Short-Circuit Current @ +/- 15 V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ +/- 15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.67E-02
-3.87E-02
-3.79E-02
-3.59E-02
-3.55E-02
-3.57E-02
-3.81E-02
-3.93E-02
-3.66E-02
-3.79E-02
-3.62E-02
10
-3.48E-02
-3.76E-02
-3.68E-02
-3.48E-02
-3.44E-02
-3.49E-02
-3.72E-02
-3.84E-02
-3.56E-02
-3.70E-02
-3.59E-02
20
-3.43E-02
-3.71E-02
-3.63E-02
-3.44E-02
-3.39E-02
-3.45E-02
-3.67E-02
-3.80E-02
-3.51E-02
-3.66E-02
-3.59E-02
30
-3.41E-02
-3.69E-02
-3.62E-02
-3.41E-02
-3.37E-02
-3.43E-02
-3.65E-02
-3.78E-02
-3.49E-02
-3.63E-02
-3.60E-02
50
-3.31E-02
-3.60E-02
-3.54E-02
-3.33E-02
-3.30E-02
-3.37E-02
-3.59E-02
-3.72E-02
-3.43E-02
-3.59E-02
-3.60E-02
60
-3.39E-02
-3.68E-02
-3.61E-02
-3.41E-02
-3.37E-02
-3.41E-02
-3.63E-02
-3.76E-02
-3.46E-02
-3.62E-02
-3.60E-02
70
-3.39E-02
-3.68E-02
-3.61E-02
-3.41E-02
-3.37E-02
-3.41E-02
-3.63E-02
-3.76E-02
-3.46E-02
-3.62E-02
-3.60E-02
-3.69E-02
1.35E-03
-3.32E-02
-4.06E-02
-3.57E-02
1.42E-03
-3.18E-02
-3.96E-02
-3.52E-02
1.42E-03
-3.13E-02
-3.91E-02
-3.50E-02
1.43E-03
-3.11E-02
-3.89E-02
-3.42E-02
1.43E-03
-3.02E-02
-3.81E-02
-3.49E-02
1.41E-03
-3.10E-02
-3.88E-02
-3.49E-02
1.41E-03
-3.10E-02
-3.88E-02
-3.75E-02
1.37E-03
-3.37E-02
-4.13E-02
-1.50E-02
PASS
-3.66E-02
1.38E-03
-3.28E-02
-4.04E-02
-1.00E-02
PASS
-3.62E-02
1.39E-03
-3.24E-02
-4.00E-02
-1.00E-02
PASS
-3.59E-02
1.39E-03
-3.21E-02
-3.98E-02
-1.00E-02
PASS
-3.54E-02
1.43E-03
-3.15E-02
-3.93E-02
-1.00E-02
PASS
-3.57E-02
1.43E-03
-3.18E-02
-3.96E-02
-1.00E-02
PASS
-3.57E-02
1.43E-03
-3.18E-02
-3.96E-02
-1.00E-02
PASS
An ISO 9001:2000 Certified Company
204
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @ +/- 15 V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.99. Plot of Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
205
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.99. Raw data for Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ +/- 15 V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.76E-02
5.05E-02
5.09E-02
5.04E-02
5.01E-02
4.92E-02
5.05E-02
5.06E-02
4.98E-02
5.04E-02
4.98E-02
10
4.84E-02
4.99E-02
5.05E-02
5.02E-02
4.98E-02
4.94E-02
5.08E-02
5.08E-02
5.01E-02
5.08E-02
5.02E-02
20
4.83E-02
4.98E-02
5.04E-02
5.00E-02
4.97E-02
4.92E-02
5.07E-02
5.07E-02
5.01E-02
5.07E-02
5.03E-02
30
4.79E-02
4.93E-02
4.99E-02
4.98E-02
4.93E-02
4.92E-02
5.06E-02
5.07E-02
4.99E-02
5.05E-02
5.01E-02
50
4.82E-02
4.95E-02
5.00E-02
4.99E-02
4.94E-02
4.91E-02
5.05E-02
5.05E-02
4.98E-02
5.04E-02
5.00E-02
60
4.71E-02
4.83E-02
4.90E-02
4.87E-02
4.83E-02
4.86E-02
5.00E-02
5.01E-02
4.94E-02
5.00E-02
5.01E-02
70
4.71E-02
4.83E-02
4.90E-02
4.87E-02
4.83E-02
4.86E-02
5.00E-02
5.01E-02
4.94E-02
5.00E-02
5.01E-02
4.99E-02
1.30E-03
5.34E-02
4.63E-02
4.98E-02
7.82E-04
5.19E-02
4.76E-02
4.96E-02
7.83E-04
5.18E-02
4.75E-02
4.92E-02
7.84E-04
5.14E-02
4.71E-02
4.94E-02
7.41E-04
5.14E-02
4.73E-02
4.83E-02
7.08E-04
5.02E-02
4.63E-02
4.83E-02
7.08E-04
5.02E-02
4.63E-02
5.01E-02
5.95E-04
5.17E-02
4.84E-02
1.50E-02
PASS
5.04E-02
6.32E-04
5.21E-02
4.86E-02
1.00E-02
PASS
5.03E-02
6.49E-04
5.21E-02
4.85E-02
1.00E-02
PASS
5.02E-02
6.43E-04
5.19E-02
4.84E-02
1.00E-02
PASS
5.01E-02
6.09E-04
5.17E-02
4.84E-02
1.00E-02
PASS
4.96E-02
6.25E-04
5.13E-02
4.79E-02
1.00E-02
PASS
4.96E-02
6.25E-04
5.13E-02
4.79E-02
1.00E-02
PASS
An ISO 9001:2000 Certified Company
206
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @ +/- 15 V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.100. Plot of Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
207
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.100. Raw data for Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ +/- 15 V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.70E-02
4.89E-02
5.03E-02
4.76E-02
4.80E-02
5.07E-02
4.90E-02
4.89E-02
4.92E-02
5.04E-02
5.00E-02
10
4.76E-02
4.83E-02
4.99E-02
4.76E-02
4.76E-02
5.09E-02
4.92E-02
4.91E-02
4.96E-02
5.07E-02
5.05E-02
20
4.75E-02
4.82E-02
4.97E-02
4.74E-02
4.74E-02
5.08E-02
4.92E-02
4.91E-02
4.95E-02
5.06E-02
5.05E-02
30
4.73E-02
4.77E-02
4.93E-02
4.71E-02
4.73E-02
5.07E-02
4.90E-02
4.90E-02
4.93E-02
5.05E-02
5.04E-02
50
4.76E-02
4.79E-02
4.94E-02
4.72E-02
4.74E-02
5.07E-02
4.89E-02
4.88E-02
4.92E-02
5.03E-02
5.03E-02
60
4.64E-02
4.70E-02
4.84E-02
4.61E-02
4.64E-02
5.01E-02
4.84E-02
4.83E-02
4.88E-02
4.99E-02
5.03E-02
70
4.64E-02
4.70E-02
4.84E-02
4.61E-02
4.64E-02
5.01E-02
4.84E-02
4.83E-02
4.88E-02
4.99E-02
5.03E-02
4.83E-02
1.28E-03
5.18E-02
4.48E-02
4.82E-02
9.85E-04
5.09E-02
4.55E-02
4.81E-02
9.90E-04
5.08E-02
4.54E-02
4.78E-02
8.93E-04
5.02E-02
4.53E-02
4.79E-02
9.05E-04
5.04E-02
4.54E-02
4.69E-02
9.34E-04
4.94E-02
4.43E-02
4.69E-02
9.34E-04
4.94E-02
4.43E-02
4.96E-02
8.42E-04
5.19E-02
4.73E-02
1.50E-02
PASS
4.99E-02
8.33E-04
5.22E-02
4.76E-02
1.00E-02
PASS
4.98E-02
8.27E-04
5.21E-02
4.76E-02
1.00E-02
PASS
4.97E-02
8.41E-04
5.20E-02
4.74E-02
1.00E-02
PASS
4.96E-02
8.68E-04
5.20E-02
4.72E-02
1.00E-02
PASS
4.91E-02
8.37E-04
5.14E-02
4.68E-02
1.00E-02
PASS
4.91E-02
8.37E-04
5.14E-02
4.68E-02
1.00E-02
PASS
An ISO 9001:2000 Certified Company
208
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @ +/- 15 V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.101. Plot of Negative Short-Circuit Current @ +/- 15 V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
209
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.101. Raw data for Negative Short-Circuit Current @ +/- 15 V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ +/- 15 V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.71E-02
4.88E-02
5.00E-02
4.76E-02
4.79E-02
5.06E-02
4.92E-02
4.89E-02
4.92E-02
5.04E-02
5.01E-02
10
4.77E-02
4.83E-02
4.97E-02
4.77E-02
4.76E-02
5.09E-02
4.95E-02
4.91E-02
4.95E-02
5.08E-02
5.06E-02
20
4.76E-02
4.81E-02
4.95E-02
4.75E-02
4.75E-02
5.07E-02
4.94E-02
4.90E-02
4.94E-02
5.07E-02
5.06E-02
30
4.74E-02
4.77E-02
4.90E-02
4.72E-02
4.73E-02
5.06E-02
4.93E-02
4.89E-02
4.93E-02
5.06E-02
5.05E-02
50
4.76E-02
4.78E-02
4.92E-02
4.73E-02
4.73E-02
5.06E-02
4.92E-02
4.88E-02
4.92E-02
5.04E-02
5.04E-02
60
4.65E-02
4.70E-02
4.82E-02
4.61E-02
4.63E-02
5.01E-02
4.87E-02
4.83E-02
4.88E-02
5.00E-02
5.04E-02
70
4.65E-02
4.70E-02
4.82E-02
4.61E-02
4.63E-02
5.01E-02
4.87E-02
4.83E-02
4.88E-02
5.00E-02
5.04E-02
4.83E-02
1.15E-03
5.14E-02
4.51E-02
4.82E-02
8.63E-04
5.06E-02
4.58E-02
4.80E-02
8.68E-04
5.04E-02
4.57E-02
4.77E-02
7.69E-04
4.98E-02
4.56E-02
4.78E-02
7.97E-04
5.00E-02
4.56E-02
4.68E-02
8.34E-04
4.91E-02
4.45E-02
4.68E-02
8.34E-04
4.91E-02
4.45E-02
4.97E-02
8.09E-04
5.19E-02
4.74E-02
1.50E-02
PASS
4.99E-02
8.19E-04
5.22E-02
4.77E-02
1.00E-02
PASS
4.98E-02
8.10E-04
5.21E-02
4.76E-02
1.00E-02
PASS
4.97E-02
7.92E-04
5.19E-02
4.76E-02
1.00E-02
PASS
4.96E-02
8.15E-04
5.19E-02
4.74E-02
1.00E-02
PASS
4.92E-02
8.13E-04
5.14E-02
4.69E-02
1.00E-02
PASS
4.92E-02
8.13E-04
5.14E-02
4.69E-02
1.00E-02
PASS
An ISO 9001:2000 Certified Company
210
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Short-Circuit Current @ +/- 15 V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.102. Plot of Negative Short-Circuit Current @ +/- 15 V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
211
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.102. Raw data for Negative Short-Circuit Current @ +/- 15 V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ +/- 15 V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.62E-02
4.88E-02
4.93E-02
4.84E-02
4.83E-02
4.76E-02
4.89E-02
4.90E-02
4.82E-02
4.86E-02
4.80E-02
10
4.70E-02
4.83E-02
4.89E-02
4.83E-02
4.80E-02
4.78E-02
4.92E-02
4.92E-02
4.85E-02
4.89E-02
4.85E-02
20
4.69E-02
4.81E-02
4.88E-02
4.82E-02
4.79E-02
4.76E-02
4.91E-02
4.91E-02
4.85E-02
4.88E-02
4.86E-02
30
4.65E-02
4.77E-02
4.84E-02
4.79E-02
4.76E-02
4.75E-02
4.90E-02
4.91E-02
4.83E-02
4.87E-02
4.84E-02
50
4.67E-02
4.78E-02
4.85E-02
4.80E-02
4.76E-02
4.75E-02
4.89E-02
4.90E-02
4.82E-02
4.85E-02
4.83E-02
60
4.57E-02
4.70E-02
4.75E-02
4.71E-02
4.68E-02
4.72E-02
4.84E-02
4.85E-02
4.78E-02
4.81E-02
4.84E-02
70
4.57E-02
4.70E-02
4.75E-02
4.71E-02
4.68E-02
4.72E-02
4.84E-02
4.85E-02
4.78E-02
4.81E-02
4.84E-02
4.82E-02
1.17E-03
5.14E-02
4.50E-02
4.81E-02
7.11E-04
5.01E-02
4.62E-02
4.80E-02
7.05E-04
4.99E-02
4.60E-02
4.76E-02
6.71E-04
4.94E-02
4.58E-02
4.77E-02
6.49E-04
4.95E-02
4.59E-02
4.68E-02
6.93E-04
4.87E-02
4.49E-02
4.68E-02
6.93E-04
4.87E-02
4.49E-02
4.84E-02
5.78E-04
5.00E-02
4.69E-02
1.50E-02
PASS
4.87E-02
6.08E-04
5.04E-02
4.70E-02
1.00E-02
PASS
4.86E-02
6.20E-04
5.03E-02
4.69E-02
1.00E-02
PASS
4.85E-02
6.25E-04
5.02E-02
4.68E-02
1.00E-02
PASS
4.84E-02
5.86E-04
5.00E-02
4.68E-02
1.00E-02
PASS
4.80E-02
5.16E-04
4.94E-02
4.66E-02
1.00E-02
PASS
4.80E-02
5.16E-04
4.94E-02
4.66E-02
1.00E-02
PASS
An ISO 9001:2000 Certified Company
212
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.00E-02
Positive Supply Current @ 3V (A)
9.50E-03
9.00E-03
8.50E-03
8.00E-03
7.50E-03
7.00E-03
6.50E-03
6.00E-03
5.50E-03
5.00E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.103. Plot of Positive Supply Current @ 3V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
213
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.103. Raw data for Positive Supply Current @ 3V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @ 3V (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.38E-03
7.54E-03
7.47E-03
7.34E-03
7.46E-03
7.47E-03
7.50E-03
7.67E-03
7.28E-03
7.60E-03
7.59E-03
10
7.10E-03
7.20E-03
7.16E-03
7.04E-03
7.12E-03
7.38E-03
7.41E-03
7.56E-03
7.16E-03
7.51E-03
7.58E-03
20
7.14E-03
7.31E-03
7.27E-03
7.14E-03
7.23E-03
7.40E-03
7.43E-03
7.58E-03
7.18E-03
7.51E-03
7.56E-03
30
7.10E-03
7.20E-03
7.16E-03
7.04E-03
7.12E-03
7.38E-03
7.41E-03
7.56E-03
7.16E-03
7.51E-03
7.58E-03
50
6.65E-03
6.82E-03
6.77E-03
6.62E-03
6.72E-03
7.35E-03
7.37E-03
7.53E-03
7.13E-03
7.47E-03
7.58E-03
60
6.69E-03
6.86E-03
6.81E-03
6.65E-03
6.75E-03
7.37E-03
7.40E-03
7.55E-03
7.15E-03
7.50E-03
7.59E-03
70
7.14E-03
7.32E-03
7.27E-03
7.13E-03
7.23E-03
7.36E-03
7.40E-03
7.55E-03
7.15E-03
7.49E-03
7.57E-03
7.44E-03
7.89E-05
7.65E-03
7.22E-03
7.12E-03
6.07E-05
7.29E-03
6.96E-03
7.22E-03
7.66E-05
7.43E-03
7.01E-03
7.12E-03
6.07E-05
7.29E-03
6.96E-03
6.72E-03
8.26E-05
6.94E-03
6.49E-03
6.75E-03
8.56E-05
6.99E-03
6.52E-03
7.22E-03
8.23E-05
7.44E-03
6.99E-03
7.50E-03
1.48E-04
7.91E-03
7.10E-03
8.80E-03
PASS
7.40E-03
1.55E-04
7.83E-03
6.98E-03
8.80E-03
PASS
7.42E-03
1.51E-04
7.84E-03
7.00E-03
8.80E-03
PASS
7.40E-03
1.55E-04
7.83E-03
6.98E-03
8.80E-03
PASS
7.37E-03
1.53E-04
7.79E-03
6.95E-03
8.80E-03
PASS
7.39E-03
1.55E-04
7.82E-03
6.97E-03
8.80E-03
PASS
7.39E-03
1.53E-04
7.81E-03
6.97E-03
8.80E-03
PASS
An ISO 9001:2000 Certified Company
214
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
-5.00E-03
Negative Supply Current @ 3V (A)
-5.50E-03
-6.00E-03
-6.50E-03
-7.00E-03
-7.50E-03
-8.00E-03
-8.50E-03
-9.00E-03
-9.50E-03
-1.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.104. Plot of Negative Supply Current @ 3V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
215
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.104. Raw data for Negative Supply Current @ 3V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @ 3V (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
-7.38E-03
-7.53E-03
-7.46E-03
-7.34E-03
-7.45E-03
-7.47E-03
-7.49E-03
-7.66E-03
-7.27E-03
-7.59E-03
-7.59E-03
10
-7.10E-03
-7.20E-03
-7.15E-03
-7.04E-03
-7.12E-03
-7.37E-03
-7.41E-03
-7.55E-03
-7.16E-03
-7.50E-03
-7.57E-03
20
-7.13E-03
-7.31E-03
-7.27E-03
-7.13E-03
-7.22E-03
-7.39E-03
-7.42E-03
-7.57E-03
-7.18E-03
-7.51E-03
-7.56E-03
30
-7.10E-03
-7.20E-03
-7.15E-03
-7.04E-03
-7.12E-03
-7.37E-03
-7.41E-03
-7.55E-03
-7.16E-03
-7.50E-03
-7.57E-03
50
-6.65E-03
-6.81E-03
-6.76E-03
-6.61E-03
-6.71E-03
-7.35E-03
-7.37E-03
-7.52E-03
-7.12E-03
-7.47E-03
-7.57E-03
60
-6.69E-03
-6.85E-03
-6.80E-03
-6.65E-03
-6.75E-03
-7.37E-03
-7.39E-03
-7.55E-03
-7.14E-03
-7.49E-03
-7.59E-03
70
-7.13E-03
-7.31E-03
-7.27E-03
-7.12E-03
-7.23E-03
-7.36E-03
-7.40E-03
-7.54E-03
-7.15E-03
-7.48E-03
-7.57E-03
-7.43E-03
7.40E-05
-7.23E-03
-7.63E-03
-7.12E-03
5.93E-05
-6.96E-03
-7.28E-03
-7.21E-03
8.14E-05
-6.99E-03
-7.44E-03
-7.12E-03
5.93E-05
-6.96E-03
-7.28E-03
-6.71E-03
8.07E-05
-6.49E-03
-6.93E-03
-6.75E-03
8.07E-05
-6.53E-03
-6.97E-03
-7.21E-03
8.44E-05
-6.98E-03
-7.44E-03
-7.50E-03
1.48E-04
-7.09E-03
-7.90E-03
-8.80E-03
PASS
-7.40E-03
1.51E-04
-6.98E-03
-7.81E-03
-8.80E-03
PASS
-7.41E-03
1.49E-04
-7.01E-03
-7.82E-03
-8.80E-03
PASS
-7.40E-03
1.51E-04
-6.98E-03
-7.81E-03
-8.80E-03
PASS
-7.37E-03
1.54E-04
-6.94E-03
-7.79E-03
-8.80E-03
PASS
-7.39E-03
1.57E-04
-6.96E-03
-7.82E-03
-8.80E-03
PASS
-7.39E-03
1.49E-04
-6.98E-03
-7.80E-03
-8.80E-03
PASS
An ISO 9001:2000 Certified Company
216
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 3V, VCM=0V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.105. Plot of Input Offset Voltage @ 3V, VCM=0V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
217
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.105. Raw data for Input Offset Voltage @ 3V, VCM=0V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=0V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.22E-04
1.53E-04
-1.24E-04
6.53E-05
-9.53E-05
-1.07E-04
-3.33E-04
7.22E-05
-3.67E-05
-7.96E-05
-2.92E-04
10
-3.00E-04
1.11E-04
-1.43E-04
6.28E-05
-1.05E-04
-1.19E-04
-3.45E-04
5.03E-05
-4.83E-05
-8.76E-05
-2.95E-04
20
-3.07E-04
1.16E-04
-1.42E-04
6.18E-05
-1.14E-04
-1.15E-04
-3.45E-04
5.09E-05
-4.78E-05
-9.04E-05
-2.96E-04
30
-3.00E-04
1.11E-04
-1.43E-04
6.28E-05
-1.05E-04
-1.19E-04
-3.45E-04
5.03E-05
-4.83E-05
-8.76E-05
-2.95E-04
50
-2.87E-04
1.09E-04
-1.48E-04
7.75E-05
-1.02E-04
-1.18E-04
-3.44E-04
5.13E-05
-4.90E-05
-8.77E-05
-2.96E-04
60
-2.88E-04
1.12E-04
-1.46E-04
8.14E-05
-9.88E-05
-1.19E-04
-3.43E-04
5.35E-05
-4.88E-05
-8.66E-05
-2.95E-04
70
-3.01E-04
9.57E-05
-1.54E-04
6.36E-05
-9.49E-05
-1.24E-04
-3.55E-04
5.47E-05
-5.31E-05
-9.72E-05
-2.95E-04
-6.46E-05
1.84E-04
4.39E-04
-5.68E-04
-7.47E-05
1.66E-04
3.80E-04
-5.29E-04
-7.71E-05
1.70E-04
3.88E-04
-5.42E-04
-7.47E-05
1.66E-04
3.80E-04
-5.29E-04
-7.00E-05
1.64E-04
3.81E-04
-5.21E-04
-6.79E-05
1.66E-04
3.88E-04
-5.23E-04
-7.82E-05
1.63E-04
3.68E-04
-5.24E-04
-9.68E-05
1.49E-04
3.11E-04
-5.05E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.10E-04
1.46E-04
2.91E-04
-5.10E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.10E-04
1.46E-04
2.91E-04
-5.10E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.10E-04
1.46E-04
2.91E-04
-5.10E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.09E-04
1.46E-04
2.90E-04
-5.09E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.09E-04
1.46E-04
2.92E-04
-5.09E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.15E-04
1.50E-04
2.98E-04
-5.28E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
218
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 3V, VCM=0V #2 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.106. Plot of Input Offset Voltage @ 3V, VCM=0V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
219
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.106. Raw data for Input Offset Voltage @ 3V, VCM=0V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=0V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.52E-04
4.28E-05
1.11E-04
2.02E-05
1.92E-04
7.45E-05
7.65E-06
-1.05E-04
-1.74E-04
-4.89E-05
-1.72E-04
10
2.45E-04
3.37E-05
1.03E-04
2.72E-05
1.58E-04
5.80E-05
2.57E-06
-1.15E-04
-1.72E-04
-6.51E-05
-1.76E-04
20
2.43E-04
3.18E-05
1.02E-04
2.30E-05
1.55E-04
5.98E-05
2.09E-06
-1.14E-04
-1.73E-04
-6.65E-05
-1.78E-04
30
2.45E-04
3.37E-05
1.03E-04
2.72E-05
1.58E-04
5.80E-05
2.57E-06
-1.15E-04
-1.72E-04
-6.51E-05
-1.76E-04
50
2.55E-04
4.62E-05
1.16E-04
4.50E-05
1.65E-04
5.79E-05
5.20E-07
-1.17E-04
-1.81E-04
-7.04E-05
-1.75E-04
60
2.60E-04
4.82E-05
1.18E-04
5.02E-05
1.74E-04
6.14E-05
2.93E-06
-1.16E-04
-1.77E-04
-6.70E-05
-1.75E-04
70
2.47E-04
5.22E-05
7.20E-05
8.73E-06
1.78E-04
6.10E-05
-4.55E-06
-1.08E-04
-1.82E-04
-5.93E-05
-1.75E-04
1.24E-04
9.80E-05
3.92E-04
-1.45E-04
1.13E-04
9.12E-05
3.63E-04
-1.37E-04
1.11E-04
9.15E-05
3.62E-04
-1.40E-04
1.13E-04
9.12E-05
3.63E-04
-1.37E-04
1.25E-04
8.82E-05
3.67E-04
-1.17E-04
1.30E-04
8.96E-05
3.76E-04
-1.15E-04
1.12E-04
9.79E-05
3.80E-04
-1.57E-04
-4.93E-05
9.66E-05
2.16E-04
-3.14E-04
-8.00E-04
PASS
8.00E-04
PASS
-5.84E-05
9.15E-05
1.93E-04
-3.09E-04
-9.50E-04
PASS
9.50E-04
PASS
-5.83E-05
9.21E-05
1.94E-04
-3.11E-04
-9.50E-04
PASS
9.50E-04
PASS
-5.84E-05
9.15E-05
1.93E-04
-3.09E-04
-9.50E-04
PASS
9.50E-04
PASS
-6.21E-05
9.44E-05
1.97E-04
-3.21E-04
-9.50E-04
PASS
9.50E-04
PASS
-5.90E-05
9.42E-05
1.99E-04
-3.17E-04
-9.50E-04
PASS
9.50E-04
PASS
-5.86E-05
9.34E-05
1.97E-04
-3.15E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
220
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 3V, VCM=0V #3 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.107. Plot of Input Offset Voltage @ 3V, VCM=0V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
221
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.107. Raw data for Input Offset Voltage @ 3V, VCM=0V #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=0V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.17E-05
-1.73E-04
-1.89E-04
1.25E-05
-1.53E-05
-5.99E-06
-2.24E-05
-1.65E-04
-2.93E-04
-5.84E-05
-2.17E-04
10
-6.37E-05
-2.13E-04
-1.81E-04
-2.76E-05
-3.12E-05
-2.62E-05
-3.44E-05
-1.74E-04
-3.03E-04
-6.59E-05
-2.17E-04
20
-6.57E-05
-2.12E-04
-1.87E-04
-2.93E-05
-3.86E-05
-2.47E-05
-3.54E-05
-1.76E-04
-3.02E-04
-6.76E-05
-2.18E-04
30
-6.37E-05
-2.13E-04
-1.81E-04
-2.76E-05
-3.12E-05
-2.62E-05
-3.44E-05
-1.74E-04
-3.03E-04
-6.59E-05
-2.17E-04
50
-7.23E-05
-2.20E-04
-1.60E-04
-1.95E-05
-3.42E-05
-2.79E-05
-3.42E-05
-1.73E-04
-3.01E-04
-6.22E-05
-2.21E-04
60
-6.98E-05
-2.14E-04
-1.55E-04
-1.91E-05
-3.08E-05
-2.52E-05
-3.19E-05
-1.71E-04
-2.99E-04
-6.19E-05
-2.19E-04
70
-9.53E-05
-2.05E-04
-1.96E-04
-2.98E-05
-4.44E-05
-1.08E-05
-4.65E-05
-1.72E-04
-3.02E-04
-6.54E-05
-2.20E-04
-7.92E-05
9.42E-05
1.79E-04
-3.38E-04
-1.04E-04
8.77E-05
1.37E-04
-3.44E-04
-1.07E-04
8.65E-05
1.31E-04
-3.44E-04
-1.04E-04
8.77E-05
1.37E-04
-3.44E-04
-1.01E-04
8.59E-05
1.34E-04
-3.37E-04
-9.78E-05
8.41E-05
1.33E-04
-3.28E-04
-1.14E-04
8.26E-05
1.12E-04
-3.41E-04
-1.09E-04
1.20E-04
2.20E-04
-4.38E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.21E-04
1.18E-04
2.02E-04
-4.43E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.21E-04
1.18E-04
2.01E-04
-4.43E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.21E-04
1.18E-04
2.02E-04
-4.43E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.20E-04
1.17E-04
2.01E-04
-4.40E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.18E-04
1.17E-04
2.03E-04
-4.38E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.19E-04
1.19E-04
2.06E-04
-4.44E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
222
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Voltage @ 3V, VCM=0V #4 (V)
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.108. Plot of Input Offset Voltage @ 3V, VCM=0V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
223
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.108. Raw data for Input Offset Voltage @ 3V, VCM=0V #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=0V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-8.06E-05
2.02E-04
-3.29E-04
1.14E-05
-1.55E-04
-4.42E-06
-1.80E-04
-2.84E-04
1.30E-04
-4.40E-05
-4.51E-05
10
-7.77E-05
1.83E-04
-3.41E-04
-1.17E-06
-1.60E-04
-1.64E-05
-1.82E-04
-2.98E-04
1.16E-04
-4.69E-05
-4.62E-05
20
-8.66E-05
1.82E-04
-3.43E-04
-3.46E-06
-1.67E-04
-1.49E-05
-1.82E-04
-2.95E-04
1.14E-04
-4.71E-05
-5.02E-05
30
-7.77E-05
1.83E-04
-3.41E-04
-1.17E-06
-1.60E-04
-1.64E-05
-1.82E-04
-2.98E-04
1.16E-04
-4.69E-05
-4.62E-05
50
-6.31E-05
1.91E-04
-3.45E-04
4.75E-06
-1.51E-04
-1.83E-05
-1.84E-04
-2.95E-04
1.15E-04
-4.85E-05
-4.85E-05
60
-6.00E-05
1.98E-04
-3.44E-04
5.23E-06
-1.50E-04
-1.70E-05
-1.82E-04
-2.94E-04
1.19E-04
-4.82E-05
-4.66E-05
70
-8.69E-05
1.73E-04
-3.63E-04
9.46E-06
-1.59E-04
-1.71E-05
-2.03E-04
-3.01E-04
1.04E-04
-4.56E-05
-4.97E-05
-7.03E-05
1.97E-04
4.69E-04
-6.10E-04
-7.95E-05
1.93E-04
4.51E-04
-6.10E-04
-8.35E-05
1.94E-04
4.50E-04
-6.17E-04
-7.95E-05
1.93E-04
4.51E-04
-6.10E-04
-7.27E-05
1.98E-04
4.69E-04
-6.14E-04
-7.03E-05
1.99E-04
4.76E-04
-6.17E-04
-8.53E-05
1.99E-04
4.60E-04
-6.30E-04
-7.65E-05
1.60E-04
3.62E-04
-5.15E-04
-8.00E-04
PASS
8.00E-04
PASS
-8.54E-05
1.59E-04
3.51E-04
-5.21E-04
-9.50E-04
PASS
9.50E-04
PASS
-8.51E-05
1.58E-04
3.48E-04
-5.18E-04
-9.50E-04
PASS
9.50E-04
PASS
-8.54E-05
1.59E-04
3.51E-04
-5.21E-04
-9.50E-04
PASS
9.50E-04
PASS
-8.62E-05
1.58E-04
3.47E-04
-5.19E-04
-9.50E-04
PASS
9.50E-04
PASS
-8.44E-05
1.59E-04
3.51E-04
-5.20E-04
-9.50E-04
PASS
9.50E-04
PASS
-9.24E-05
1.60E-04
3.46E-04
-5.30E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
224
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 3V, VCM=0V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.109. Plot of Input Offset Current @ 3V, VCM=0V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
225
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.109. Raw data for Input Offset Current @ 3V, VCM=0V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=0V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.62E-10
7.59E-09
2.21E-10
4.79E-09
2.83E-10
-3.41E-09
5.04E-10
-6.32E-10
-3.51E-09
-2.54E-09
-6.24E-10
10
2.35E-10
6.49E-09
-2.08E-10
4.10E-09
-8.50E-11
-3.35E-09
-5.00E-10
-8.54E-10
-3.00E-09
-3.22E-09
-6.53E-10
20
1.63E-10
7.16E-09
-4.46E-10
4.15E-09
2.00E-12
-3.46E-09
-1.10E-11
-1.17E-09
-2.74E-09
-2.67E-09
-6.20E-10
30
2.35E-10
6.49E-09
-2.08E-10
4.10E-09
-8.50E-11
-3.35E-09
-5.00E-10
-8.54E-10
-3.00E-09
-3.22E-09
-6.53E-10
50
9.12E-10
6.32E-09
-6.59E-10
3.96E-09
-2.10E-11
-3.50E-09
3.17E-10
-5.65E-10
-3.04E-09
-3.12E-09
-6.47E-10
60
8.49E-10
6.16E-09
-6.26E-10
3.96E-09
-1.22E-10
-3.59E-09
1.00E-12
-6.62E-10
-2.65E-09
-3.48E-09
-6.67E-10
70
1.23E-10
6.07E-09
-9.60E-10
4.21E-09
1.83E-10
-4.08E-09
-4.28E-10
-8.13E-10
-3.11E-09
-3.26E-09
-5.97E-10
2.67E-09
3.36E-09
1.19E-08
-6.55E-09
2.11E-09
3.04E-09
1.04E-08
-6.22E-09
2.20E-09
3.33E-09
1.13E-08
-6.92E-09
2.11E-09
3.04E-09
1.04E-08
-6.22E-09
2.10E-09
2.95E-09
1.02E-08
-5.98E-09
2.04E-09
2.91E-09
1.00E-08
-5.94E-09
1.92E-09
3.04E-09
1.03E-08
-6.41E-09
-1.92E-09
1.78E-09
2.96E-09
-6.79E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.19E-09
1.39E-09
1.62E-09
-5.99E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.01E-09
1.39E-09
1.81E-09
-5.83E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.19E-09
1.39E-09
1.62E-09
-5.99E-09
-6.50E-08
PASS
6.50E-08
PASS
-1.98E-09
1.73E-09
2.77E-09
-6.73E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.08E-09
1.65E-09
2.45E-09
-6.61E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.34E-09
1.62E-09
2.10E-09
-6.78E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
226
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 3V, VCM=0V #2 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.110. Plot of Input Offset Current @ 3V, VCM=0V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
227
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.110. Raw data for Input Offset Current @ 3V, VCM=0V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=0V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.12E-08
2.70E-10
1.19E-09
5.62E-09
1.56E-09
1.34E-09
2.11E-09
4.10E-09
-1.64E-09
1.14E-09
-5.12E-09
10
-1.03E-08
2.70E-10
7.02E-10
5.47E-09
1.58E-09
1.85E-09
1.90E-09
4.07E-09
-1.64E-09
1.48E-09
-5.24E-09
20
-1.08E-08
2.51E-10
7.09E-10
5.29E-09
1.03E-09
2.02E-09
1.90E-09
3.92E-09
-1.80E-09
1.36E-09
-5.28E-09
30
-1.03E-08
2.70E-10
7.02E-10
5.47E-09
1.58E-09
1.85E-09
1.90E-09
4.07E-09
-1.64E-09
1.48E-09
-5.24E-09
50
-1.08E-08
-4.60E-11
4.36E-10
5.10E-09
1.51E-09
1.30E-09
1.08E-09
4.14E-09
-1.25E-09
1.37E-09
-5.23E-09
60
-1.05E-08
2.08E-10
2.64E-10
5.10E-09
1.71E-09
1.55E-09
9.99E-10
4.04E-09
-1.25E-09
1.59E-09
-5.21E-09
70
-1.09E-08
2.85E-10
3.17E-10
5.65E-09
1.37E-09
1.41E-09
1.69E-09
3.89E-09
-1.45E-09
1.17E-09
-5.14E-09
-5.04E-10
6.30E-09
1.68E-08
-1.78E-08
-4.64E-10
5.89E-09
1.57E-08
-1.66E-08
-7.02E-10
5.99E-09
1.57E-08
-1.71E-08
-4.64E-10
5.89E-09
1.57E-08
-1.66E-08
-7.55E-10
5.95E-09
1.56E-08
-1.71E-08
-6.40E-10
5.85E-09
1.54E-08
-1.67E-08
-6.64E-10
6.15E-09
1.62E-08
-1.75E-08
1.41E-09
2.07E-09
7.08E-09
-4.26E-09
-6.50E-08
PASS
6.50E-08
PASS
1.53E-09
2.04E-09
7.13E-09
-4.07E-09
-6.50E-08
PASS
6.50E-08
PASS
1.48E-09
2.07E-09
7.16E-09
-4.20E-09
-6.50E-08
PASS
6.50E-08
PASS
1.53E-09
2.04E-09
7.13E-09
-4.07E-09
-6.50E-08
PASS
6.50E-08
PASS
1.33E-09
1.91E-09
6.57E-09
-3.92E-09
-6.50E-08
PASS
6.50E-08
PASS
1.39E-09
1.88E-09
6.55E-09
-3.78E-09
-6.50E-08
PASS
6.50E-08
PASS
1.34E-09
1.90E-09
6.55E-09
-3.87E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
228
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 3V, VCM=0V #3 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.111. Plot of Input Offset Current @ 3V, VCM=0V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
229
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.111. Raw data for Input Offset Current @ 3V, VCM=0V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=0V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.72E-10
-7.66E-10
4.63E-09
-1.01E-09
-2.82E-09
-4.11E-09
-3.33E-09
2.81E-09
2.94E-10
3.23E-09
2.44E-09
10
-8.88E-10
-6.57E-10
4.85E-09
-2.36E-09
-2.30E-09
-3.85E-09
-3.20E-09
3.84E-09
7.33E-10
3.36E-09
2.47E-09
20
-9.61E-10
-1.05E-09
4.77E-09
-2.41E-09
-2.40E-09
-3.94E-09
-3.23E-09
2.90E-09
4.75E-10
2.90E-09
2.45E-09
30
-8.88E-10
-6.57E-10
4.85E-09
-2.36E-09
-2.30E-09
-3.85E-09
-3.20E-09
3.84E-09
7.33E-10
3.36E-09
2.47E-09
50
-6.91E-10
-1.20E-09
4.73E-09
-2.52E-09
-2.32E-09
-3.06E-09
-3.25E-09
4.06E-09
1.20E-09
2.80E-09
2.45E-09
60
-7.22E-10
-8.94E-10
4.76E-09
-2.57E-09
-2.33E-09
-3.06E-09
-3.01E-09
3.58E-09
1.02E-09
2.93E-09
2.47E-09
70
-3.41E-10
-6.61E-10
5.13E-09
-1.69E-09
-3.01E-09
-3.77E-09
-3.24E-09
3.18E-09
8.65E-10
3.22E-09
2.50E-09
-6.54E-11
2.79E-09
7.58E-09
-7.71E-09
-2.72E-10
2.97E-09
7.86E-09
-8.41E-09
-4.10E-10
2.98E-09
7.76E-09
-8.58E-09
-2.72E-10
2.97E-09
7.86E-09
-8.41E-09
-4.01E-10
2.97E-09
7.73E-09
-8.53E-09
-3.51E-10
2.97E-09
7.80E-09
-8.50E-09
-1.15E-10
3.11E-09
8.42E-09
-8.65E-09
-2.19E-10
3.39E-09
9.09E-09
-9.53E-09
-6.50E-08
PASS
6.50E-08
PASS
1.78E-10
3.58E-09
1.00E-08
-9.65E-09
-6.50E-08
PASS
6.50E-08
PASS
-1.78E-10
3.27E-09
8.80E-09
-9.15E-09
-6.50E-08
PASS
6.50E-08
PASS
1.78E-10
3.58E-09
1.00E-08
-9.65E-09
-6.50E-08
PASS
6.50E-08
PASS
3.49E-10
3.36E-09
9.55E-09
-8.86E-09
-6.50E-08
PASS
6.50E-08
PASS
2.90E-10
3.18E-09
9.01E-09
-8.43E-09
-6.50E-08
PASS
6.50E-08
PASS
5.34E-11
3.39E-09
9.34E-09
-9.24E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
230
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 3V, VCM=0V #4 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.112. Plot of Input Offset Current @ 3V, VCM=0V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
231
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.112. Raw data for Input Offset Current @ 3V, VCM=0V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=0V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.03E-09
3.82E-09
-4.34E-09
-1.57E-09
-1.42E-09
-1.43E-09
2.65E-09
-1.22E-08
-3.82E-09
-4.53E-09
-2.67E-10
10
-2.25E-09
4.55E-09
-4.48E-09
-1.29E-09
-1.71E-09
-1.31E-09
2.56E-09
-1.31E-08
-2.88E-09
-4.53E-09
-2.09E-10
20
-2.38E-09
4.11E-09
-4.40E-09
-1.25E-09
-1.96E-09
-1.49E-09
2.18E-09
-1.26E-08
-3.75E-09
-3.94E-09
-2.29E-10
30
-2.25E-09
4.55E-09
-4.48E-09
-1.29E-09
-1.71E-09
-1.31E-09
2.56E-09
-1.31E-08
-2.88E-09
-4.53E-09
-2.09E-10
50
-2.11E-09
4.49E-09
-3.95E-09
-5.79E-10
-2.14E-09
-1.80E-09
3.15E-09
-1.16E-08
-2.93E-09
-4.05E-09
-3.00E-10
60
-2.28E-09
4.44E-09
-4.19E-09
-5.06E-10
-2.00E-09
-1.62E-09
3.13E-09
-1.17E-08
-3.01E-09
-3.76E-09
-2.72E-10
70
-2.97E-09
4.56E-09
-3.59E-09
-1.16E-09
-1.72E-09
-1.80E-09
3.09E-09
-1.29E-08
-3.17E-09
-4.16E-09
-2.49E-10
-1.11E-09
2.99E-09
7.10E-09
-9.32E-09
-1.04E-09
3.36E-09
8.16E-09
-1.02E-08
-1.18E-09
3.18E-09
7.53E-09
-9.88E-09
-1.04E-09
3.36E-09
8.16E-09
-1.02E-08
-8.56E-10
3.22E-09
7.97E-09
-9.68E-09
-9.07E-10
3.27E-09
8.05E-09
-9.86E-09
-9.75E-10
3.24E-09
7.91E-09
-9.86E-09
-3.87E-09
5.46E-09
1.11E-08
-1.88E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.86E-09
5.81E-09
1.21E-08
-1.98E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.92E-09
5.44E-09
1.10E-08
-1.88E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.86E-09
5.81E-09
1.21E-08
-1.98E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.45E-09
5.33E-09
1.12E-08
-1.81E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.39E-09
5.35E-09
1.13E-08
-1.81E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.78E-09
5.79E-09
1.21E-08
-1.97E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
232
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=0V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.113. Plot of Positive Input Bias Current @ 3V, VCM=0V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
233
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.113. Raw data for Positive Input Bias Current @ 3V, VCM=0V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=0V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.34E-07
-3.06E-07
-3.02E-07
-3.21E-07
-3.31E-07
-3.32E-07
-3.28E-07
-3.13E-07
-3.09E-07
-3.11E-07
-3.29E-07
10
-3.40E-07
-3.17E-07
-3.12E-07
-3.28E-07
-3.40E-07
-3.60E-07
-3.58E-07
-3.39E-07
-3.33E-07
-3.35E-07
-3.30E-07
20
-3.44E-07
-3.15E-07
-3.10E-07
-3.27E-07
-3.39E-07
-3.57E-07
-3.54E-07
-3.34E-07
-3.29E-07
-3.30E-07
-3.31E-07
30
-3.40E-07
-3.17E-07
-3.12E-07
-3.28E-07
-3.40E-07
-3.60E-07
-3.58E-07
-3.39E-07
-3.33E-07
-3.35E-07
-3.30E-07
50
-3.41E-07
-3.21E-07
-3.14E-07
-3.30E-07
-3.44E-07
-3.65E-07
-3.66E-07
-3.50E-07
-3.40E-07
-3.47E-07
-3.30E-07
60
-3.39E-07
-3.19E-07
-3.13E-07
-3.28E-07
-3.40E-07
-3.65E-07
-3.64E-07
-3.49E-07
-3.38E-07
-3.41E-07
-3.29E-07
70
-3.38E-07
-3.15E-07
-3.09E-07
-3.25E-07
-3.36E-07
-3.54E-07
-3.51E-07
-3.32E-07
-3.25E-07
-3.29E-07
-3.30E-07
-3.19E-07
1.45E-08
-2.79E-07
-3.59E-07
-3.27E-07
1.29E-08
-2.92E-07
-3.63E-07
-3.27E-07
1.47E-08
-2.87E-07
-3.67E-07
-3.27E-07
1.29E-08
-2.92E-07
-3.63E-07
-3.30E-07
1.28E-08
-2.95E-07
-3.65E-07
-3.28E-07
1.21E-08
-2.94E-07
-3.61E-07
-3.25E-07
1.28E-08
-2.90E-07
-3.60E-07
-3.19E-07
1.07E-08
-2.89E-07
-3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.45E-07
1.31E-08
-3.09E-07
-3.81E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.41E-07
1.34E-08
-3.04E-07
-3.77E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.45E-07
1.31E-08
-3.09E-07
-3.81E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.53E-07
1.15E-08
-3.22E-07
-3.85E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.51E-07
1.27E-08
-3.16E-07
-3.86E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.38E-07
1.32E-08
-3.02E-07
-3.74E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
234
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=0V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.114. Plot of Positive Input Bias Current @ 3V, VCM=0V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
235
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.114. Raw data for Positive Input Bias Current @ 3V, VCM=0V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=0V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.30E-07
-3.17E-07
-3.14E-07
-3.14E-07
-3.21E-07
-3.03E-07
-3.30E-07
-3.26E-07
-3.11E-07
-3.13E-07
-3.11E-07
10
-3.34E-07
-3.26E-07
-3.22E-07
-3.20E-07
-3.29E-07
-3.26E-07
-3.55E-07
-3.54E-07
-3.35E-07
-3.38E-07
-3.12E-07
20
-3.36E-07
-3.25E-07
-3.21E-07
-3.19E-07
-3.28E-07
-3.21E-07
-3.52E-07
-3.51E-07
-3.30E-07
-3.34E-07
-3.12E-07
30
-3.34E-07
-3.26E-07
-3.22E-07
-3.20E-07
-3.29E-07
-3.26E-07
-3.55E-07
-3.54E-07
-3.35E-07
-3.38E-07
-3.12E-07
50
-3.35E-07
-3.28E-07
-3.25E-07
-3.22E-07
-3.30E-07
-3.33E-07
-3.62E-07
-3.63E-07
-3.41E-07
-3.53E-07
-3.11E-07
60
-3.33E-07
-3.26E-07
-3.23E-07
-3.20E-07
-3.28E-07
-3.31E-07
-3.60E-07
-3.60E-07
-3.39E-07
-3.48E-07
-3.11E-07
70
-3.33E-07
-3.23E-07
-3.20E-07
-3.17E-07
-3.26E-07
-3.20E-07
-3.49E-07
-3.50E-07
-3.28E-07
-3.32E-07
-3.12E-07
-3.19E-07
6.69E-09
-3.01E-07
-3.37E-07
-3.26E-07
5.44E-09
-3.11E-07
-3.41E-07
-3.26E-07
6.62E-09
-3.08E-07
-3.44E-07
-3.26E-07
5.44E-09
-3.11E-07
-3.41E-07
-3.28E-07
5.09E-09
-3.14E-07
-3.42E-07
-3.26E-07
5.06E-09
-3.12E-07
-3.40E-07
-3.24E-07
6.09E-09
-3.07E-07
-3.41E-07
-3.17E-07
1.13E-08
-2.86E-07
-3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.41E-07
1.28E-08
-3.06E-07
-3.77E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.38E-07
1.34E-08
-3.01E-07
-3.74E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.41E-07
1.28E-08
-3.06E-07
-3.77E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.50E-07
1.31E-08
-3.15E-07
-3.86E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.48E-07
1.29E-08
-3.12E-07
-3.83E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.36E-07
1.31E-08
-3.00E-07
-3.72E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
236
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=0V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.115. Plot of Positive Input Bias Current @ 3V, VCM=0V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
237
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.115. Raw data for Positive Input Bias Current @ 3V, VCM=0V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=0V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.13E-07
-3.17E-07
-3.16E-07
-3.21E-07
-3.20E-07
-3.05E-07
-3.33E-07
-3.29E-07
-3.10E-07
-3.14E-07
-3.09E-07
10
-3.19E-07
-3.27E-07
-3.25E-07
-3.28E-07
-3.28E-07
-3.28E-07
-3.57E-07
-3.58E-07
-3.34E-07
-3.38E-07
-3.10E-07
20
-3.20E-07
-3.26E-07
-3.23E-07
-3.27E-07
-3.27E-07
-3.23E-07
-3.53E-07
-3.55E-07
-3.30E-07
-3.34E-07
-3.11E-07
30
-3.19E-07
-3.27E-07
-3.25E-07
-3.28E-07
-3.28E-07
-3.28E-07
-3.57E-07
-3.58E-07
-3.34E-07
-3.38E-07
-3.10E-07
50
-3.20E-07
-3.30E-07
-3.27E-07
-3.29E-07
-3.29E-07
-3.34E-07
-3.63E-07
-3.66E-07
-3.41E-07
-3.51E-07
-3.10E-07
60
-3.18E-07
-3.29E-07
-3.25E-07
-3.27E-07
-3.27E-07
-3.33E-07
-3.61E-07
-3.63E-07
-3.39E-07
-3.49E-07
-3.09E-07
70
-3.17E-07
-3.25E-07
-3.22E-07
-3.25E-07
-3.24E-07
-3.22E-07
-3.51E-07
-3.54E-07
-3.27E-07
-3.32E-07
-3.10E-07
-3.17E-07
2.85E-09
-3.10E-07
-3.25E-07
-3.25E-07
3.78E-09
-3.15E-07
-3.36E-07
-3.25E-07
2.86E-09
-3.17E-07
-3.32E-07
-3.25E-07
3.78E-09
-3.15E-07
-3.36E-07
-3.27E-07
4.11E-09
-3.16E-07
-3.38E-07
-3.25E-07
4.06E-09
-3.14E-07
-3.36E-07
-3.23E-07
3.07E-09
-3.14E-07
-3.31E-07
-3.18E-07
1.22E-08
-2.85E-07
-3.51E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.43E-07
1.37E-08
-3.05E-07
-3.80E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.42E-08
-3.00E-07
-3.78E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.43E-07
1.37E-08
-3.05E-07
-3.80E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.51E-07
1.37E-08
-3.14E-07
-3.89E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.49E-07
1.32E-08
-3.13E-07
-3.85E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.37E-07
1.43E-08
-2.98E-07
-3.76E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
238
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=0V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.116. Plot of Positive Input Bias Current @ 3V, VCM=0V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
239
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.116. Raw data for Positive Input Bias Current @ 3V, VCM=0V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=0V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.46E-07
-3.02E-07
-3.05E-07
-3.19E-07
-3.30E-07
-3.29E-07
-3.32E-07
-3.23E-07
-3.06E-07
-3.11E-07
-3.27E-07
10
-3.52E-07
-3.13E-07
-3.14E-07
-3.25E-07
-3.38E-07
-3.54E-07
-3.60E-07
-3.52E-07
-3.29E-07
-3.34E-07
-3.28E-07
20
-3.54E-07
-3.12E-07
-3.12E-07
-3.24E-07
-3.37E-07
-3.52E-07
-3.56E-07
-3.48E-07
-3.25E-07
-3.30E-07
-3.29E-07
30
-3.52E-07
-3.13E-07
-3.14E-07
-3.25E-07
-3.38E-07
-3.54E-07
-3.60E-07
-3.52E-07
-3.29E-07
-3.34E-07
-3.28E-07
50
-3.52E-07
-3.16E-07
-3.16E-07
-3.26E-07
-3.40E-07
-3.62E-07
-3.67E-07
-3.59E-07
-3.36E-07
-3.46E-07
-3.28E-07
60
-3.51E-07
-3.14E-07
-3.15E-07
-3.24E-07
-3.38E-07
-3.59E-07
-3.65E-07
-3.57E-07
-3.34E-07
-3.39E-07
-3.27E-07
70
-3.52E-07
-3.11E-07
-3.11E-07
-3.23E-07
-3.35E-07
-3.50E-07
-3.55E-07
-3.47E-07
-3.22E-07
-3.28E-07
-3.28E-07
-3.21E-07
1.80E-08
-2.71E-07
-3.70E-07
-3.28E-07
1.67E-08
-2.83E-07
-3.74E-07
-3.28E-07
1.78E-08
-2.79E-07
-3.77E-07
-3.28E-07
1.67E-08
-2.83E-07
-3.74E-07
-3.30E-07
1.56E-08
-2.87E-07
-3.73E-07
-3.28E-07
1.58E-08
-2.85E-07
-3.72E-07
-3.26E-07
1.73E-08
-2.79E-07
-3.74E-07
-3.20E-07
1.14E-08
-2.89E-07
-3.51E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.46E-07
1.37E-08
-3.08E-07
-3.84E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.42E-07
1.38E-08
-3.04E-07
-3.80E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.46E-07
1.37E-08
-3.08E-07
-3.84E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.54E-07
1.27E-08
-3.19E-07
-3.89E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.51E-07
1.35E-08
-3.14E-07
-3.88E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.40E-07
1.45E-08
-3.01E-07
-3.80E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
240
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=0V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.117. Plot of Negative Input Bias Current @ 3V, VCM=0V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
241
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.117. Raw data for Negative Input Bias Current @ 3V, VCM=0V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=0V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.35E-07
-3.13E-07
-3.03E-07
-3.26E-07
-3.31E-07
-3.29E-07
-3.28E-07
-3.12E-07
-3.06E-07
-3.09E-07
-3.29E-07
10
-3.41E-07
-3.24E-07
-3.12E-07
-3.32E-07
-3.40E-07
-3.58E-07
-3.59E-07
-3.38E-07
-3.30E-07
-3.32E-07
-3.30E-07
20
-3.46E-07
-3.23E-07
-3.10E-07
-3.31E-07
-3.39E-07
-3.54E-07
-3.56E-07
-3.33E-07
-3.26E-07
-3.28E-07
-3.30E-07
30
-3.41E-07
-3.24E-07
-3.12E-07
-3.32E-07
-3.40E-07
-3.58E-07
-3.59E-07
-3.38E-07
-3.30E-07
-3.32E-07
-3.30E-07
50
-3.44E-07
-3.27E-07
-3.14E-07
-3.34E-07
-3.46E-07
-3.63E-07
-3.68E-07
-3.50E-07
-3.37E-07
-3.40E-07
-3.29E-07
60
-3.41E-07
-3.25E-07
-3.12E-07
-3.32E-07
-3.40E-07
-3.62E-07
-3.66E-07
-3.48E-07
-3.35E-07
-3.37E-07
-3.28E-07
70
-3.39E-07
-3.21E-07
-3.09E-07
-3.30E-07
-3.37E-07
-3.51E-07
-3.52E-07
-3.32E-07
-3.23E-07
-3.26E-07
-3.29E-07
-3.22E-07
1.34E-08
-2.85E-07
-3.58E-07
-3.30E-07
1.22E-08
-2.96E-07
-3.63E-07
-3.30E-07
1.41E-08
-2.91E-07
-3.69E-07
-3.30E-07
1.22E-08
-2.96E-07
-3.63E-07
-3.33E-07
1.31E-08
-2.97E-07
-3.69E-07
-3.30E-07
1.17E-08
-2.98E-07
-3.62E-07
-3.27E-07
1.24E-08
-2.93E-07
-3.61E-07
-3.17E-07
1.12E-08
-2.86E-07
-3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.43E-07
1.42E-08
-3.04E-07
-3.82E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.45E-08
-3.00E-07
-3.79E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.43E-07
1.42E-08
-3.04E-07
-3.82E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.51E-07
1.37E-08
-3.14E-07
-3.89E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.50E-07
1.40E-08
-3.11E-07
-3.88E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.37E-07
1.40E-08
-2.98E-07
-3.75E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
242
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=0V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.118. Plot of Negative Input Bias Current @ 3V, VCM=0V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
243
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.118. Raw data for Negative Input Bias Current @ 3V, VCM=0V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=0V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.19E-07
-3.17E-07
-3.15E-07
-3.20E-07
-3.23E-07
-3.04E-07
-3.32E-07
-3.31E-07
-3.10E-07
-3.15E-07
-3.06E-07
10
-3.24E-07
-3.26E-07
-3.23E-07
-3.26E-07
-3.31E-07
-3.27E-07
-3.57E-07
-3.61E-07
-3.33E-07
-3.40E-07
-3.07E-07
20
-3.26E-07
-3.25E-07
-3.22E-07
-3.25E-07
-3.29E-07
-3.23E-07
-3.53E-07
-3.57E-07
-3.29E-07
-3.35E-07
-3.07E-07
30
-3.24E-07
-3.26E-07
-3.23E-07
-3.26E-07
-3.31E-07
-3.27E-07
-3.57E-07
-3.61E-07
-3.33E-07
-3.40E-07
-3.07E-07
50
-3.25E-07
-3.29E-07
-3.25E-07
-3.28E-07
-3.32E-07
-3.35E-07
-3.63E-07
-3.68E-07
-3.41E-07
-3.55E-07
-3.06E-07
60
-3.23E-07
-3.27E-07
-3.23E-07
-3.26E-07
-3.30E-07
-3.32E-07
-3.60E-07
-3.65E-07
-3.39E-07
-3.54E-07
-3.06E-07
70
-3.22E-07
-3.24E-07
-3.20E-07
-3.23E-07
-3.27E-07
-3.22E-07
-3.52E-07
-3.54E-07
-3.27E-07
-3.34E-07
-3.06E-07
-3.19E-07
2.90E-09
-3.11E-07
-3.27E-07
-3.26E-07
2.93E-09
-3.18E-07
-3.34E-07
-3.25E-07
2.68E-09
-3.18E-07
-3.33E-07
-3.26E-07
2.93E-09
-3.18E-07
-3.34E-07
-3.28E-07
2.93E-09
-3.20E-07
-3.36E-07
-3.26E-07
3.03E-09
-3.18E-07
-3.34E-07
-3.23E-07
2.49E-09
-3.17E-07
-3.30E-07
-3.18E-07
1.27E-08
-2.84E-07
-3.53E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.44E-07
1.48E-08
-3.03E-07
-3.84E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.47E-08
-2.99E-07
-3.80E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.44E-07
1.48E-08
-3.03E-07
-3.84E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.52E-07
1.43E-08
-3.13E-07
-3.91E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.50E-07
1.40E-08
-3.12E-07
-3.88E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.37E-07
1.45E-08
-2.98E-07
-3.77E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
244
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=0V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.119. Plot of Negative Input Bias Current @ 3V, VCM=0V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
245
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.119. Raw data for Negative Input Bias Current @ 3V, VCM=0V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=0V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.13E-07
-3.17E-07
-3.21E-07
-3.20E-07
-3.17E-07
-3.01E-07
-3.30E-07
-3.32E-07
-3.11E-07
-3.17E-07
-3.12E-07
10
-3.18E-07
-3.27E-07
-3.30E-07
-3.26E-07
-3.26E-07
-3.24E-07
-3.54E-07
-3.63E-07
-3.35E-07
-3.47E-07
-3.13E-07
20
-3.20E-07
-3.25E-07
-3.28E-07
-3.25E-07
-3.25E-07
-3.19E-07
-3.52E-07
-3.58E-07
-3.31E-07
-3.37E-07
-3.13E-07
30
-3.18E-07
-3.27E-07
-3.30E-07
-3.26E-07
-3.26E-07
-3.24E-07
-3.54E-07
-3.63E-07
-3.35E-07
-3.47E-07
-3.13E-07
50
-3.20E-07
-3.29E-07
-3.32E-07
-3.27E-07
-3.27E-07
-3.32E-07
-3.60E-07
-3.71E-07
-3.46E-07
-3.55E-07
-3.12E-07
60
-3.18E-07
-3.28E-07
-3.30E-07
-3.25E-07
-3.25E-07
-3.30E-07
-3.59E-07
-3.68E-07
-3.41E-07
-3.53E-07
-3.11E-07
70
-3.17E-07
-3.24E-07
-3.27E-07
-3.23E-07
-3.22E-07
-3.19E-07
-3.49E-07
-3.56E-07
-3.28E-07
-3.35E-07
-3.13E-07
-3.18E-07
3.05E-09
-3.09E-07
-3.26E-07
-3.25E-07
4.24E-09
-3.14E-07
-3.37E-07
-3.25E-07
3.20E-09
-3.16E-07
-3.33E-07
-3.25E-07
4.24E-09
-3.14E-07
-3.37E-07
-3.27E-07
4.60E-09
-3.14E-07
-3.39E-07
-3.25E-07
4.49E-09
-3.13E-07
-3.37E-07
-3.23E-07
3.63E-09
-3.13E-07
-3.33E-07
-3.18E-07
1.30E-08
-2.83E-07
-3.54E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.45E-07
1.53E-08
-3.03E-07
-3.87E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.56E-08
-2.97E-07
-3.82E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.45E-07
1.53E-08
-3.03E-07
-3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.53E-07
1.48E-08
-3.12E-07
-3.93E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.50E-07
1.50E-08
-3.09E-07
-3.91E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.38E-07
1.52E-08
-2.96E-07
-3.79E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
246
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=0V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.120. Plot of Negative Input Bias Current @ 3V, VCM=0V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
247
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.120. Raw data for Negative Input Bias Current @ 3V, VCM=0V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=0V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.47E-07
-3.07E-07
-3.01E-07
-3.17E-07
-3.29E-07
-3.28E-07
-3.34E-07
-3.12E-07
-3.02E-07
-3.06E-07
-3.27E-07
10
-3.51E-07
-3.18E-07
-3.10E-07
-3.24E-07
-3.37E-07
-3.55E-07
-3.65E-07
-3.36E-07
-3.26E-07
-3.30E-07
-3.28E-07
20
-3.52E-07
-3.16E-07
-3.08E-07
-3.23E-07
-3.36E-07
-3.52E-07
-3.60E-07
-3.32E-07
-3.22E-07
-3.26E-07
-3.29E-07
30
-3.51E-07
-3.18E-07
-3.10E-07
-3.24E-07
-3.37E-07
-3.55E-07
-3.65E-07
-3.36E-07
-3.26E-07
-3.30E-07
-3.28E-07
50
-3.52E-07
-3.21E-07
-3.13E-07
-3.26E-07
-3.38E-07
-3.62E-07
-3.72E-07
-3.49E-07
-3.33E-07
-3.38E-07
-3.28E-07
60
-3.51E-07
-3.19E-07
-3.11E-07
-3.24E-07
-3.36E-07
-3.59E-07
-3.70E-07
-3.46E-07
-3.31E-07
-3.36E-07
-3.27E-07
70
-3.50E-07
-3.15E-07
-3.08E-07
-3.22E-07
-3.34E-07
-3.48E-07
-3.58E-07
-3.30E-07
-3.19E-07
-3.24E-07
-3.28E-07
-3.20E-07
1.84E-08
-2.70E-07
-3.71E-07
-3.28E-07
1.64E-08
-2.83E-07
-3.73E-07
-3.27E-07
1.74E-08
-2.79E-07
-3.75E-07
-3.28E-07
1.64E-08
-2.83E-07
-3.73E-07
-3.30E-07
1.54E-08
-2.88E-07
-3.72E-07
-3.28E-07
1.58E-08
-2.85E-07
-3.71E-07
-3.26E-07
1.67E-08
-2.80E-07
-3.72E-07
-3.16E-07
1.40E-08
-2.78E-07
-3.55E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.42E-07
1.69E-08
-2.96E-07
-3.89E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.38E-07
1.68E-08
-2.92E-07
-3.84E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.42E-07
1.69E-08
-2.96E-07
-3.89E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.51E-07
1.62E-08
-3.06E-07
-3.95E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.48E-07
1.60E-08
-3.05E-07
-3.92E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.36E-07
1.67E-08
-2.90E-07
-3.82E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
248
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 3V, VCM=3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.121. Plot of Input Offset Voltage @ 3V, VCM=3V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
249
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.121. Raw data for Input Offset Voltage @ 3V, VCM=3V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.54E-05
1.77E-04
1.41E-04
2.08E-04
-7.87E-05
1.03E-04
-1.20E-04
-3.34E-05
2.64E-04
-1.73E-04
-2.42E-04
10
2.49E-05
1.42E-04
1.26E-04
2.05E-04
-8.12E-05
9.73E-05
-1.31E-04
-4.30E-05
2.59E-04
-1.69E-04
-2.42E-04
20
2.01E-05
1.46E-04
1.26E-04
2.05E-04
-8.43E-05
9.90E-05
-1.31E-04
-4.34E-05
2.59E-04
-1.73E-04
-2.42E-04
30
2.49E-05
1.42E-04
1.26E-04
2.05E-04
-8.12E-05
9.73E-05
-1.31E-04
-4.30E-05
2.59E-04
-1.69E-04
-2.42E-04
50
3.53E-05
1.42E-04
1.24E-04
2.20E-04
-7.79E-05
1.02E-04
-1.29E-04
-4.07E-05
2.61E-04
-1.67E-04
-2.44E-04
60
3.54E-05
1.43E-04
1.25E-04
2.23E-04
-7.66E-05
1.02E-04
-1.27E-04
-4.00E-05
2.62E-04
-1.67E-04
-2.44E-04
70
8.49E-06
1.25E-04
1.15E-04
1.95E-04
-5.61E-05
7.69E-05
-1.32E-04
-3.66E-05
2.56E-04
-1.49E-04
-2.43E-04
9.26E-05
1.21E-04
4.23E-04
-2.38E-04
8.34E-05
1.13E-04
3.92E-04
-2.25E-04
8.25E-05
1.15E-04
3.97E-04
-2.32E-04
8.34E-05
1.13E-04
3.92E-04
-2.25E-04
8.87E-05
1.14E-04
4.01E-04
-2.24E-04
8.99E-05
1.14E-04
4.04E-04
-2.24E-04
7.74E-05
1.00E-04
3.52E-04
-1.97E-04
7.99E-06
1.77E-04
4.93E-04
-4.77E-04
-8.00E-04
PASS
8.00E-04
PASS
2.67E-06
1.76E-04
4.86E-04
-4.81E-04
-9.50E-04
PASS
9.50E-04
PASS
2.33E-06
1.77E-04
4.89E-04
-4.84E-04
-9.50E-04
PASS
9.50E-04
PASS
2.67E-06
1.76E-04
4.86E-04
-4.81E-04
-9.50E-04
PASS
9.50E-04
PASS
5.20E-06
1.76E-04
4.89E-04
-4.79E-04
-9.50E-04
PASS
9.50E-04
PASS
5.85E-06
1.77E-04
4.90E-04
-4.78E-04
-9.50E-04
PASS
9.50E-04
PASS
3.03E-06
1.68E-04
4.63E-04
-4.57E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
250
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 3V, VCM=3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.122. Plot of Input Offset Voltage @ 3V, VCM=3V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
251
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.122. Raw data for Input Offset Voltage @ 3V, VCM=3V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.98E-04
2.21E-04
2.76E-04
4.20E-04
4.39E-04
3.91E-04
1.79E-04
-1.06E-04
3.79E-06
1.06E-04
-9.86E-05
10
1.98E-04
2.11E-04
2.66E-04
4.14E-04
4.07E-04
3.86E-04
1.86E-04
-1.07E-04
7.28E-06
9.39E-05
-9.77E-05
20
1.97E-04
2.09E-04
2.64E-04
4.12E-04
4.07E-04
3.86E-04
1.84E-04
-1.09E-04
5.23E-06
9.36E-05
-1.01E-04
30
1.98E-04
2.11E-04
2.66E-04
4.14E-04
4.07E-04
3.86E-04
1.86E-04
-1.07E-04
7.28E-06
9.39E-05
-9.77E-05
50
2.15E-04
2.31E-04
2.78E-04
4.29E-04
4.17E-04
3.87E-04
1.89E-04
-1.07E-04
2.09E-06
9.59E-05
-1.01E-04
60
2.20E-04
2.32E-04
2.79E-04
4.33E-04
4.24E-04
3.88E-04
1.89E-04
-1.09E-04
5.83E-06
9.72E-05
-1.02E-04
70
1.91E-04
2.17E-04
2.52E-04
4.02E-04
4.10E-04
3.79E-04
1.78E-04
-1.11E-04
-4.92E-06
8.48E-05
-1.00E-04
3.11E-04
1.12E-04
6.19E-04
2.76E-06
2.99E-04
1.05E-04
5.87E-04
1.15E-05
2.98E-04
1.05E-04
5.86E-04
9.37E-06
2.99E-04
1.05E-04
5.87E-04
1.15E-05
3.14E-04
1.02E-04
5.94E-04
3.38E-05
3.18E-04
1.04E-04
6.02E-04
3.36E-05
2.94E-04
1.04E-04
5.80E-04
9.35E-06
1.15E-04
1.88E-04
6.31E-04
-4.01E-04
-8.00E-04
PASS
8.00E-04
PASS
1.13E-04
1.87E-04
6.26E-04
-3.99E-04
-9.50E-04
PASS
9.50E-04
PASS
1.12E-04
1.88E-04
6.27E-04
-4.03E-04
-9.50E-04
PASS
9.50E-04
PASS
1.13E-04
1.87E-04
6.26E-04
-3.99E-04
-9.50E-04
PASS
9.50E-04
PASS
1.13E-04
1.88E-04
6.29E-04
-4.03E-04
-9.50E-04
PASS
9.50E-04
PASS
1.14E-04
1.89E-04
6.32E-04
-4.03E-04
-9.50E-04
PASS
9.50E-04
PASS
1.05E-04
1.87E-04
6.18E-04
-4.08E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
252
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 3V, VCM=3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.123. Plot of Input Offset Voltage @ 3V, VCM=3V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
253
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.123. Raw data for Input Offset Voltage @ 3V, VCM=3V #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
9.04E-05
1.39E-04
1.72E-04
3.02E-04
3.97E-05
1.25E-04
5.22E-05
2.49E-04
-1.49E-04
2.24E-04
1.42E-04
10
7.60E-05
8.91E-05
1.65E-04
2.66E-04
3.18E-05
1.15E-04
4.71E-05
2.41E-04
-1.53E-04
2.17E-04
1.41E-04
20
7.42E-05
9.16E-05
1.63E-04
2.63E-04
2.19E-05
1.13E-04
4.56E-05
2.40E-04
-1.55E-04
2.15E-04
1.40E-04
30
7.60E-05
8.91E-05
1.65E-04
2.66E-04
3.18E-05
1.15E-04
4.71E-05
2.41E-04
-1.53E-04
2.17E-04
1.41E-04
50
7.26E-05
7.82E-05
1.77E-04
2.75E-04
3.24E-05
1.16E-04
4.78E-05
2.41E-04
-1.51E-04
2.21E-04
1.38E-04
60
7.35E-05
8.30E-05
1.82E-04
2.79E-04
3.31E-05
1.18E-04
4.79E-05
2.44E-04
-1.49E-04
2.20E-04
1.40E-04
70
5.40E-05
8.58E-05
1.57E-04
2.75E-04
3.45E-05
1.16E-04
3.26E-05
2.39E-04
-1.56E-04
2.13E-04
1.39E-04
1.49E-04
9.92E-05
4.21E-04
-1.24E-04
1.26E-04
9.22E-05
3.79E-04
-1.27E-04
1.23E-04
9.33E-05
3.79E-04
-1.33E-04
1.26E-04
9.22E-05
3.79E-04
-1.27E-04
1.27E-04
9.85E-05
3.97E-04
-1.43E-04
1.30E-04
9.96E-05
4.03E-04
-1.43E-04
1.21E-04
9.77E-05
3.89E-04
-1.47E-04
1.00E-04
1.60E-04
5.39E-04
-3.38E-04
-8.00E-04
PASS
8.00E-04
PASS
9.35E-05
1.59E-04
5.28E-04
-3.41E-04
-9.50E-04
PASS
9.50E-04
PASS
9.18E-05
1.58E-04
5.26E-04
-3.43E-04
-9.50E-04
PASS
9.50E-04
PASS
9.35E-05
1.59E-04
5.28E-04
-3.41E-04
-9.50E-04
PASS
9.50E-04
PASS
9.49E-05
1.58E-04
5.29E-04
-3.39E-04
-9.50E-04
PASS
9.50E-04
PASS
9.62E-05
1.58E-04
5.30E-04
-3.37E-04
-9.50E-04
PASS
9.50E-04
PASS
8.89E-05
1.60E-04
5.27E-04
-3.49E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
254
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 3V, VCM=3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.124. Plot of Input Offset Voltage @ 3V, VCM=3V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
255
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.124. Raw data for Input Offset Voltage @ 3V, VCM=3V #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 3V, VCM=3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-4.65E-05
3.11E-04
-1.43E-04
1.22E-04
-1.69E-04
1.73E-04
9.04E-05
6.25E-05
4.25E-04
7.92E-05
4.39E-05
10
-3.17E-05
2.96E-04
-1.55E-04
1.18E-04
-1.65E-04
1.66E-04
8.83E-05
6.38E-05
4.18E-04
8.31E-05
4.29E-05
20
-3.98E-05
2.96E-04
-1.59E-04
1.13E-04
-1.73E-04
1.68E-04
8.76E-05
6.36E-05
4.16E-04
8.34E-05
4.24E-05
30
-3.17E-05
2.96E-04
-1.55E-04
1.18E-04
-1.65E-04
1.66E-04
8.83E-05
6.38E-05
4.18E-04
8.31E-05
4.29E-05
50
-1.20E-05
3.04E-04
-1.59E-04
1.27E-04
-1.53E-04
1.66E-04
8.69E-05
7.01E-05
4.20E-04
8.30E-05
4.16E-05
60
-1.23E-05
3.09E-04
-1.59E-04
1.27E-04
-1.53E-04
1.68E-04
8.93E-05
6.95E-05
4.24E-04
8.33E-05
4.24E-05
70
-3.38E-05
2.88E-04
-1.58E-04
1.29E-04
-1.59E-04
1.67E-04
8.57E-05
6.48E-05
4.13E-04
7.84E-05
4.17E-05
1.50E-05
2.01E-04
5.66E-04
-5.36E-04
1.25E-05
1.96E-04
5.49E-04
-5.24E-04
7.43E-06
1.98E-04
5.50E-04
-5.35E-04
1.25E-05
1.96E-04
5.49E-04
-5.24E-04
2.13E-05
1.97E-04
5.62E-04
-5.19E-04
2.24E-05
1.99E-04
5.67E-04
-5.22E-04
1.34E-05
1.94E-04
5.45E-04
-5.18E-04
1.66E-04
1.51E-04
5.80E-04
-2.48E-04
-8.00E-04
PASS
8.00E-04
PASS
1.64E-04
1.47E-04
5.68E-04
-2.40E-04
-9.50E-04
PASS
9.50E-04
PASS
1.64E-04
1.46E-04
5.65E-04
-2.38E-04
-9.50E-04
PASS
9.50E-04
PASS
1.64E-04
1.47E-04
5.68E-04
-2.40E-04
-9.50E-04
PASS
9.50E-04
PASS
1.65E-04
1.47E-04
5.69E-04
-2.39E-04
-9.50E-04
PASS
9.50E-04
PASS
1.67E-04
1.49E-04
5.75E-04
-2.41E-04
-9.50E-04
PASS
9.50E-04
PASS
1.62E-04
1.46E-04
5.62E-04
-2.39E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
256
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 3V, VCM=3V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.125. Plot of Input Offset Current @ 3V, VCM=3V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
257
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.125. Raw data for Input Offset Current @ 3V, VCM=3V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=3V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
5.54E-09
1.02E-08
8.17E-09
-5.27E-09
6.91E-09
-1.07E-08
-2.63E-08
-2.66E-09
-3.53E-09
8.01E-09
-6.17E-09
10
5.11E-09
8.01E-09
7.09E-09
-5.83E-09
9.97E-09
-9.88E-09
-2.84E-08
-2.32E-09
-3.13E-09
1.04E-08
-6.19E-09
20
5.09E-09
8.82E-09
7.00E-09
-5.00E-09
1.30E-08
-1.05E-08
-2.81E-08
-2.11E-09
-2.15E-09
9.70E-09
-6.12E-09
30
5.11E-09
8.01E-09
7.09E-09
-5.83E-09
9.97E-09
-9.88E-09
-2.84E-08
-2.32E-09
-3.13E-09
1.04E-08
-6.19E-09
50
5.86E-09
7.91E-09
7.14E-09
-5.83E-09
9.40E-09
-9.33E-09
-2.82E-08
-2.99E-09
-4.14E-09
9.53E-09
-6.01E-09
60
5.84E-09
7.53E-09
6.92E-09
-5.47E-09
9.41E-09
-8.97E-09
-2.74E-08
-2.42E-09
-3.35E-09
1.01E-08
-6.03E-09
70
4.28E-09
9.23E-09
7.73E-09
-5.73E-09
8.64E-09
-1.10E-08
-2.82E-08
-2.11E-09
-4.27E-09
8.81E-09
-6.06E-09
5.10E-09
6.05E-09
2.17E-08
-1.15E-08
4.87E-09
6.23E-09
2.20E-08
-1.22E-08
5.77E-09
6.69E-09
2.41E-08
-1.26E-08
4.87E-09
6.23E-09
2.20E-08
-1.22E-08
4.90E-09
6.13E-09
2.17E-08
-1.19E-08
4.85E-09
5.91E-09
2.11E-08
-1.14E-08
4.83E-09
6.21E-09
2.18E-08
-1.22E-08
-7.04E-09
1.27E-08
2.78E-08
-4.18E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.66E-09
1.42E-08
3.22E-08
-4.55E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.63E-09
1.40E-08
3.18E-08
-4.50E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.66E-09
1.42E-08
3.22E-08
-4.55E-08
-6.50E-08
PASS
6.50E-08
PASS
-7.03E-09
1.37E-08
3.06E-08
-4.46E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.41E-09
1.37E-08
3.11E-08
-4.39E-08
-6.50E-08
PASS
6.50E-08
PASS
-7.35E-09
1.37E-08
3.01E-08
-4.48E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
258
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 3V, VCM=3V #2 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.126. Plot of Input Offset Current @ 3V, VCM=3V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
259
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.126. Raw data for Input Offset Current @ 3V, VCM=3V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=3V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.31E-08
-2.10E-08
-1.52E-09
7.24E-09
6.39E-09
5.50E-09
1.43E-08
-4.19E-09
1.46E-09
-5.48E-09
-2.84E-10
10
1.24E-08
-2.29E-08
7.60E-11
6.38E-09
4.15E-09
9.57E-09
1.50E-08
-2.12E-09
-2.41E-10
-4.52E-09
-3.29E-10
20
1.34E-08
-2.12E-08
-1.17E-09
7.13E-09
6.02E-09
9.52E-09
1.50E-08
-3.47E-09
-8.44E-10
-5.37E-09
-5.12E-10
30
1.24E-08
-2.29E-08
7.60E-11
6.38E-09
4.15E-09
9.57E-09
1.50E-08
-2.12E-09
-2.41E-10
-4.52E-09
-3.29E-10
50
1.33E-08
-1.36E-08
5.77E-10
6.45E-09
6.38E-09
9.48E-09
1.51E-08
-3.88E-09
-6.32E-10
-3.50E-09
-3.23E-10
60
1.64E-08
-1.37E-08
2.71E-10
5.90E-09
5.50E-09
8.78E-09
1.58E-08
-3.82E-09
1.42E-10
-3.24E-09
-3.54E-10
70
1.42E-08
-1.96E-08
-3.42E-10
5.99E-09
5.93E-09
7.92E-09
1.40E-08
-3.26E-09
1.35E-09
-5.69E-09
-3.86E-10
8.34E-10
1.33E-08
3.72E-08
-3.56E-08
1.14E-11
1.36E-08
3.72E-08
-3.72E-08
8.26E-10
1.33E-08
3.74E-08
-3.58E-08
1.14E-11
1.36E-08
3.72E-08
-3.72E-08
2.63E-09
1.01E-08
3.04E-08
-2.51E-08
2.88E-09
1.09E-08
3.29E-08
-2.71E-08
1.23E-09
1.27E-08
3.61E-08
-3.37E-08
2.33E-09
8.04E-09
2.44E-08
-1.97E-08
-6.50E-08
PASS
6.50E-08
PASS
3.54E-09
8.35E-09
2.64E-08
-1.94E-08
-6.50E-08
PASS
6.50E-08
PASS
2.97E-09
8.86E-09
2.73E-08
-2.13E-08
-6.50E-08
PASS
6.50E-08
PASS
3.54E-09
8.35E-09
2.64E-08
-1.94E-08
-6.50E-08
PASS
6.50E-08
PASS
3.31E-09
8.52E-09
2.67E-08
-2.01E-08
-6.50E-08
PASS
6.50E-08
PASS
3.54E-09
8.52E-09
2.69E-08
-1.98E-08
-6.50E-08
PASS
6.50E-08
PASS
2.87E-09
8.11E-09
2.51E-08
-1.94E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
260
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Input Offset Current @ 3V, VCM=3V #3 (A)
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.127. Plot of Input Offset Current @ 3V, VCM=3V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
261
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.127. Raw data for Input Offset Current @ 3V, VCM=3V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=3V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.09E-08
-1.79E-08
-1.66E-08
1.33E-08
-3.39E-09
-4.65E-10
3.25E-09
-6.76E-10
-4.08E-10
7.40E-10
-2.23E-09
10
1.11E-08
-1.70E-08
-1.53E-08
1.10E-08
-4.01E-09
-3.71E-10
4.76E-09
2.21E-09
1.64E-09
3.35E-10
-2.42E-09
20
1.22E-08
-1.81E-08
-1.58E-08
1.06E-08
-5.13E-09
-2.06E-10
3.28E-09
2.22E-10
4.49E-10
6.41E-10
-2.25E-09
30
1.11E-08
-1.70E-08
-1.53E-08
1.10E-08
-4.01E-09
-3.71E-10
4.76E-09
2.21E-09
1.64E-09
3.35E-10
-2.42E-09
50
1.07E-08
-1.80E-08
-1.65E-08
1.13E-08
-4.15E-09
3.63E-10
3.54E-09
6.07E-10
1.02E-09
2.95E-10
-2.22E-09
60
1.15E-08
-1.75E-08
-1.59E-08
1.12E-08
-4.35E-09
7.67E-10
3.29E-09
1.45E-09
1.86E-09
-3.79E-10
-2.29E-09
70
1.05E-08
-1.73E-08
-1.53E-08
1.20E-08
-3.86E-09
-4.56E-10
2.09E-09
3.75E-10
-5.55E-10
-1.29E-09
-2.31E-09
-2.72E-09
1.47E-08
3.76E-08
-4.31E-08
-2.85E-09
1.36E-08
3.46E-08
-4.03E-08
-3.24E-09
1.43E-08
3.59E-08
-4.23E-08
-2.85E-09
1.36E-08
3.46E-08
-4.03E-08
-3.33E-09
1.42E-08
3.55E-08
-4.21E-08
-2.99E-09
1.41E-08
3.55E-08
-4.15E-08
-2.79E-09
1.38E-08
3.51E-08
-4.07E-08
4.88E-10
1.64E-09
4.99E-09
-4.01E-09
-6.50E-08
PASS
6.50E-08
PASS
1.71E-09
1.99E-09
7.16E-09
-3.73E-09
-6.50E-08
PASS
6.50E-08
PASS
8.76E-10
1.38E-09
4.65E-09
-2.90E-09
-6.50E-08
PASS
6.50E-08
PASS
1.71E-09
1.99E-09
7.16E-09
-3.73E-09
-6.50E-08
PASS
6.50E-08
PASS
1.17E-09
1.36E-09
4.88E-09
-2.55E-09
-6.50E-08
PASS
6.50E-08
PASS
1.40E-09
1.36E-09
5.11E-09
-2.32E-09
-6.50E-08
PASS
6.50E-08
PASS
3.28E-11
1.29E-09
3.58E-09
-3.51E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
262
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 3V, VCM=3V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.128. Plot of Input Offset Current @ 3V, VCM=3V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
263
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.128. Raw data for Input Offset Current @ 3V, VCM=3V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 3V, VCM=3V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.21E-08
-1.27E-09
-6.13E-09
-1.22E-08
6.87E-09
-8.33E-09
2.57E-09
1.37E-08
1.75E-09
-8.83E-09
-5.45E-09
10
1.12E-08
-7.82E-10
-5.29E-09
-1.20E-08
6.54E-09
-8.09E-09
2.22E-09
1.25E-08
6.33E-10
-7.79E-09
-5.39E-09
20
1.24E-08
-2.67E-10
-6.29E-09
-1.27E-08
6.43E-09
-7.63E-09
1.68E-09
1.32E-08
8.66E-10
-7.29E-09
-5.50E-09
30
1.12E-08
-7.82E-10
-5.29E-09
-1.20E-08
6.54E-09
-8.09E-09
2.22E-09
1.25E-08
6.33E-10
-7.79E-09
-5.39E-09
50
1.18E-08
-1.08E-09
-5.57E-09
-1.26E-08
6.84E-09
-8.74E-09
1.23E-09
1.21E-08
2.37E-09
-8.75E-09
-5.38E-09
60
1.14E-08
-7.94E-10
-5.01E-09
-1.16E-08
7.02E-09
-7.74E-09
1.86E-09
1.25E-08
2.79E-09
-8.12E-09
-5.24E-09
70
1.15E-08
-8.55E-10
-4.74E-09
-1.15E-08
6.67E-09
-8.40E-09
1.74E-09
1.37E-08
1.93E-09
-8.42E-09
-5.33E-09
-1.10E-10
9.77E-09
2.67E-08
-2.69E-08
-7.86E-11
9.23E-09
2.52E-08
-2.54E-08
-9.82E-11
9.96E-09
2.72E-08
-2.74E-08
-7.86E-11
9.23E-09
2.52E-08
-2.54E-08
-1.19E-10
9.70E-09
2.65E-08
-2.67E-08
1.96E-10
9.20E-09
2.54E-08
-2.50E-08
2.08E-10
9.10E-09
2.52E-08
-2.48E-08
1.72E-10
9.28E-09
2.56E-08
-2.53E-08
-6.50E-08
PASS
6.50E-08
PASS
-9.42E-11
8.50E-09
2.32E-08
-2.34E-08
-6.50E-08
PASS
6.50E-08
PASS
1.62E-10
8.49E-09
2.35E-08
-2.31E-08
-6.50E-08
PASS
6.50E-08
PASS
-9.42E-11
8.50E-09
2.32E-08
-2.34E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.68E-10
8.73E-09
2.36E-08
-2.43E-08
-6.50E-08
PASS
6.50E-08
PASS
2.48E-10
8.55E-09
2.37E-08
-2.32E-08
-6.50E-08
PASS
6.50E-08
PASS
1.08E-10
9.16E-09
2.52E-08
-2.50E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
264
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=3V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.129. Plot of Positive Input Bias Current @ 3V, VCM=3V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
265
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.129. Raw data for Positive Input Bias Current @ 3V, VCM=3V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=3V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.75E-07
3.85E-07
3.81E-07
4.07E-07
4.25E-07
4.44E-07
4.11E-07
3.86E-07
4.19E-07
3.93E-07
4.46E-07
10
5.45E-07
4.26E-07
4.19E-07
4.39E-07
4.62E-07
5.31E-07
5.00E-07
4.70E-07
5.12E-07
4.80E-07
4.45E-07
20
5.29E-07
4.17E-07
4.11E-07
4.32E-07
4.58E-07
5.11E-07
4.82E-07
4.53E-07
4.92E-07
4.62E-07
4.45E-07
30
5.45E-07
4.26E-07
4.19E-07
4.39E-07
4.62E-07
5.31E-07
5.00E-07
4.70E-07
5.12E-07
4.80E-07
4.45E-07
50
5.70E-07
4.43E-07
4.35E-07
4.52E-07
4.76E-07
5.62E-07
5.32E-07
5.00E-07
5.42E-07
5.09E-07
4.46E-07
60
5.67E-07
4.41E-07
4.34E-07
4.51E-07
4.74E-07
5.57E-07
5.27E-07
4.94E-07
5.37E-07
5.05E-07
4.46E-07
70
5.31E-07
4.22E-07
4.16E-07
4.34E-07
4.56E-07
5.12E-07
4.82E-07
4.58E-07
4.90E-07
4.65E-07
4.45E-07
4.15E-07
3.80E-08
5.19E-07
3.11E-07
4.58E-07
5.09E-08
5.98E-07
3.19E-07
4.49E-07
4.81E-08
5.81E-07
3.17E-07
4.58E-07
5.09E-08
5.98E-07
3.19E-07
4.75E-07
5.50E-08
6.26E-07
3.24E-07
4.73E-07
5.45E-08
6.23E-07
3.24E-07
4.52E-07
4.67E-08
5.80E-07
3.24E-07
4.11E-07
2.29E-08
4.73E-07
3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
4.99E-07
2.46E-08
5.66E-07
4.31E-07
-7.00E-07
PASS
7.00E-07
PASS
4.80E-07
2.33E-08
5.44E-07
4.16E-07
-7.50E-07
PASS
7.50E-07
PASS
4.99E-07
2.46E-08
5.66E-07
4.31E-07
-7.50E-07
PASS
7.50E-07
PASS
5.29E-07
2.50E-08
5.98E-07
4.60E-07
-8.00E-07
PASS
8.00E-07
PASS
5.24E-07
2.53E-08
5.94E-07
4.55E-07
-8.00E-07
PASS
8.00E-07
PASS
4.82E-07
2.15E-08
5.41E-07
4.23E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
266
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=3V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.130. Plot of Positive Input Bias Current @ 3V, VCM=3V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
267
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.130. Raw data for Positive Input Bias Current @ 3V, VCM=3V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=3V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.51E-07
4.39E-07
4.17E-07
4.45E-07
4.65E-07
3.55E-07
4.32E-07
4.44E-07
4.18E-07
3.92E-07
3.92E-07
10
5.12E-07
4.83E-07
4.56E-07
4.83E-07
5.05E-07
4.37E-07
5.14E-07
5.37E-07
5.16E-07
4.82E-07
3.94E-07
20
5.03E-07
4.73E-07
4.46E-07
4.75E-07
4.98E-07
4.20E-07
4.98E-07
5.15E-07
4.98E-07
4.63E-07
3.92E-07
30
5.12E-07
4.83E-07
4.56E-07
4.83E-07
5.05E-07
4.37E-07
5.14E-07
5.37E-07
5.16E-07
4.82E-07
3.94E-07
50
5.40E-07
5.02E-07
4.71E-07
4.99E-07
5.23E-07
4.63E-07
5.43E-07
5.66E-07
5.47E-07
5.16E-07
3.92E-07
60
5.38E-07
4.99E-07
4.69E-07
4.95E-07
5.20E-07
4.61E-07
5.39E-07
5.63E-07
5.45E-07
5.11E-07
3.92E-07
70
5.06E-07
4.78E-07
4.51E-07
4.77E-07
5.03E-07
4.25E-07
4.95E-07
5.22E-07
4.98E-07
4.67E-07
3.91E-07
4.43E-07
1.77E-08
4.92E-07
3.95E-07
4.88E-07
2.21E-08
5.48E-07
4.27E-07
4.79E-07
2.31E-08
5.42E-07
4.16E-07
4.88E-07
2.21E-08
5.48E-07
4.27E-07
5.07E-07
2.63E-08
5.79E-07
4.35E-07
5.04E-07
2.62E-08
5.76E-07
4.32E-07
4.83E-07
2.22E-08
5.44E-07
4.22E-07
4.08E-07
3.56E-08
5.06E-07
3.10E-07
-6.50E-07
PASS
6.50E-07
PASS
4.97E-07
3.91E-08
6.04E-07
3.90E-07
-7.00E-07
PASS
7.00E-07
PASS
4.78E-07
3.80E-08
5.83E-07
3.74E-07
-7.50E-07
PASS
7.50E-07
PASS
4.97E-07
3.91E-08
6.04E-07
3.90E-07
-7.50E-07
PASS
7.50E-07
PASS
5.27E-07
4.02E-08
6.37E-07
4.17E-07
-8.00E-07
PASS
8.00E-07
PASS
5.24E-07
3.99E-08
6.33E-07
4.14E-07
-8.00E-07
PASS
8.00E-07
PASS
4.81E-07
3.72E-08
5.83E-07
3.79E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
268
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=3V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.131. Plot of Positive Input Bias Current @ 3V, VCM=3V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
269
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.131. Raw data for Positive Input Bias Current @ 3V, VCM=3V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=3V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.42E-07
4.40E-07
4.16E-07
4.51E-07
4.51E-07
3.57E-07
4.20E-07
4.53E-07
4.23E-07
3.93E-07
3.89E-07
10
5.06E-07
4.86E-07
4.51E-07
4.92E-07
4.91E-07
4.38E-07
5.01E-07
5.44E-07
5.16E-07
4.83E-07
3.87E-07
20
4.94E-07
4.76E-07
4.40E-07
4.82E-07
4.83E-07
4.19E-07
4.81E-07
5.25E-07
4.97E-07
4.64E-07
3.90E-07
30
5.06E-07
4.86E-07
4.51E-07
4.92E-07
4.91E-07
4.38E-07
5.01E-07
5.44E-07
5.16E-07
4.83E-07
3.87E-07
50
5.30E-07
5.03E-07
4.64E-07
5.10E-07
5.07E-07
4.65E-07
5.31E-07
5.76E-07
5.47E-07
5.14E-07
3.89E-07
60
5.27E-07
5.00E-07
4.62E-07
5.05E-07
5.06E-07
4.61E-07
5.26E-07
5.73E-07
5.44E-07
5.10E-07
3.87E-07
70
4.94E-07
4.80E-07
4.47E-07
4.84E-07
4.86E-07
4.25E-07
4.82E-07
5.28E-07
4.97E-07
4.67E-07
3.88E-07
4.40E-07
1.44E-08
4.79E-07
4.00E-07
4.85E-07
2.06E-08
5.42E-07
4.29E-07
4.75E-07
2.07E-08
5.32E-07
4.18E-07
4.85E-07
2.06E-08
5.42E-07
4.29E-07
5.03E-07
2.40E-08
5.69E-07
4.37E-07
5.00E-07
2.37E-08
5.65E-07
4.35E-07
4.78E-07
1.82E-08
5.28E-07
4.28E-07
4.09E-07
3.62E-08
5.08E-07
3.10E-07
-6.50E-07
PASS
6.50E-07
PASS
4.97E-07
3.95E-08
6.05E-07
3.88E-07
-7.00E-07
PASS
7.00E-07
PASS
4.77E-07
3.97E-08
5.86E-07
3.69E-07
-7.50E-07
PASS
7.50E-07
PASS
4.97E-07
3.95E-08
6.05E-07
3.88E-07
-7.50E-07
PASS
7.50E-07
PASS
5.27E-07
4.13E-08
6.40E-07
4.13E-07
-8.00E-07
PASS
8.00E-07
PASS
5.23E-07
4.15E-08
6.37E-07
4.09E-07
-8.00E-07
PASS
8.00E-07
PASS
4.80E-07
3.78E-08
5.83E-07
3.76E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
270
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 3V, VCM=3V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.132. Plot of Positive Input Bias Current @ 3V, VCM=3V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
271
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.132. Raw data for Positive Input Bias Current @ 3V, VCM=3V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 3V, VCM=3V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.82E-07
3.81E-07
3.73E-07
4.12E-07
4.30E-07
4.40E-07
4.13E-07
3.98E-07
4.13E-07
3.80E-07
4.45E-07
10
5.45E-07
4.23E-07
4.10E-07
4.44E-07
4.66E-07
5.25E-07
5.05E-07
4.83E-07
5.04E-07
4.59E-07
4.45E-07
20
5.33E-07
4.12E-07
4.01E-07
4.36E-07
4.57E-07
5.05E-07
4.85E-07
4.64E-07
4.85E-07
4.43E-07
4.45E-07
30
5.45E-07
4.23E-07
4.10E-07
4.44E-07
4.66E-07
5.25E-07
5.05E-07
4.83E-07
5.04E-07
4.59E-07
4.45E-07
50
5.72E-07
4.40E-07
4.25E-07
4.56E-07
4.78E-07
5.55E-07
5.38E-07
5.11E-07
5.35E-07
4.89E-07
4.45E-07
60
5.66E-07
4.37E-07
4.25E-07
4.54E-07
4.76E-07
5.51E-07
5.33E-07
5.07E-07
5.33E-07
4.85E-07
4.45E-07
70
5.36E-07
4.18E-07
4.04E-07
4.40E-07
4.60E-07
5.06E-07
4.86E-07
4.70E-07
4.89E-07
4.48E-07
4.45E-07
4.16E-07
4.34E-08
5.35E-07
2.97E-07
4.58E-07
5.32E-08
6.04E-07
3.12E-07
4.48E-07
5.23E-08
5.91E-07
3.05E-07
4.58E-07
5.32E-08
6.04E-07
3.12E-07
4.74E-07
5.79E-08
6.33E-07
3.16E-07
4.71E-07
5.61E-08
6.25E-07
3.18E-07
4.52E-07
5.18E-08
5.94E-07
3.10E-07
4.09E-07
2.21E-08
4.69E-07
3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
4.95E-07
2.49E-08
5.63E-07
4.27E-07
-7.00E-07
PASS
7.00E-07
PASS
4.76E-07
2.37E-08
5.41E-07
4.12E-07
-7.50E-07
PASS
7.50E-07
PASS
4.95E-07
2.49E-08
5.63E-07
4.27E-07
-7.50E-07
PASS
7.50E-07
PASS
5.25E-07
2.58E-08
5.96E-07
4.54E-07
-8.00E-07
PASS
8.00E-07
PASS
5.22E-07
2.60E-08
5.93E-07
4.50E-07
-8.00E-07
PASS
8.00E-07
PASS
4.80E-07
2.18E-08
5.39E-07
4.20E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
272
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=3V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.133. Plot of Negative Input Bias Current @ 3V, VCM=3V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
273
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.133. Raw data for Negative Input Bias Current @ 3V, VCM=3V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=3V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.69E-07
3.76E-07
3.75E-07
4.12E-07
4.16E-07
4.54E-07
4.35E-07
3.87E-07
4.20E-07
3.87E-07
4.50E-07
10
5.38E-07
4.17E-07
4.12E-07
4.44E-07
4.52E-07
5.41E-07
5.28E-07
4.72E-07
5.14E-07
4.69E-07
4.49E-07
20
5.24E-07
4.06E-07
4.02E-07
4.36E-07
4.44E-07
5.21E-07
5.10E-07
4.54E-07
4.94E-07
4.52E-07
4.51E-07
30
5.38E-07
4.17E-07
4.12E-07
4.44E-07
4.52E-07
5.41E-07
5.28E-07
4.72E-07
5.14E-07
4.69E-07
4.49E-07
50
5.64E-07
4.36E-07
4.27E-07
4.58E-07
4.65E-07
5.70E-07
5.59E-07
5.02E-07
5.48E-07
4.98E-07
4.51E-07
60
5.59E-07
4.33E-07
4.26E-07
4.56E-07
4.64E-07
5.66E-07
5.56E-07
4.98E-07
5.42E-07
4.95E-07
4.50E-07
70
5.27E-07
4.14E-07
4.09E-07
4.40E-07
4.49E-07
5.25E-07
5.11E-07
4.60E-07
4.97E-07
4.57E-07
4.50E-07
4.10E-07
3.84E-08
5.15E-07
3.04E-07
4.53E-07
5.07E-08
5.92E-07
3.14E-07
4.42E-07
4.91E-08
5.77E-07
3.08E-07
4.53E-07
5.07E-08
5.92E-07
3.14E-07
4.70E-07
5.49E-08
6.20E-07
3.19E-07
4.68E-07
5.36E-08
6.14E-07
3.21E-07
4.47E-07
4.73E-08
5.77E-07
3.18E-07
4.17E-07
2.97E-08
4.98E-07
3.35E-07
-6.50E-07
PASS
6.50E-07
PASS
5.05E-07
3.28E-08
5.95E-07
4.15E-07
-7.00E-07
PASS
7.00E-07
PASS
4.86E-07
3.21E-08
5.74E-07
3.98E-07
-7.50E-07
PASS
7.50E-07
PASS
5.05E-07
3.28E-08
5.95E-07
4.15E-07
-7.50E-07
PASS
7.50E-07
PASS
5.36E-07
3.32E-08
6.27E-07
4.45E-07
-8.00E-07
PASS
8.00E-07
PASS
5.31E-07
3.31E-08
6.22E-07
4.41E-07
-8.00E-07
PASS
8.00E-07
PASS
4.90E-07
3.05E-08
5.73E-07
4.06E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
274
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=3V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.134. Plot of Negative Input Bias Current @ 3V, VCM=3V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
275
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.134. Raw data for Negative Input Bias Current @ 3V, VCM=3V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=3V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.36E-07
4.60E-07
4.19E-07
4.38E-07
4.59E-07
3.47E-07
4.19E-07
4.49E-07
4.17E-07
4.00E-07
3.91E-07
10
5.01E-07
5.04E-07
4.55E-07
4.75E-07
5.02E-07
4.27E-07
4.99E-07
5.38E-07
5.14E-07
4.86E-07
3.95E-07
20
4.90E-07
4.91E-07
4.47E-07
4.67E-07
4.94E-07
4.09E-07
4.81E-07
5.19E-07
4.95E-07
4.65E-07
3.91E-07
30
5.01E-07
5.04E-07
4.55E-07
4.75E-07
5.02E-07
4.27E-07
4.99E-07
5.38E-07
5.14E-07
4.86E-07
3.95E-07
50
5.25E-07
5.16E-07
4.72E-07
4.92E-07
5.16E-07
4.53E-07
5.29E-07
5.71E-07
5.50E-07
5.17E-07
3.94E-07
60
5.20E-07
5.14E-07
4.69E-07
4.90E-07
5.14E-07
4.52E-07
5.25E-07
5.67E-07
5.45E-07
5.13E-07
3.94E-07
70
4.90E-07
4.97E-07
4.53E-07
4.72E-07
4.96E-07
4.15E-07
4.82E-07
5.24E-07
4.98E-07
4.74E-07
3.95E-07
4.42E-07
1.69E-08
4.89E-07
3.96E-07
4.87E-07
2.17E-08
5.47E-07
4.28E-07
4.78E-07
2.04E-08
5.34E-07
4.22E-07
4.87E-07
2.17E-08
5.47E-07
4.28E-07
5.04E-07
2.18E-08
5.64E-07
4.44E-07
5.01E-07
2.15E-08
5.60E-07
4.42E-07
4.82E-07
1.91E-08
5.34E-07
4.29E-07
4.07E-07
3.73E-08
5.09E-07
3.04E-07
-6.50E-07
PASS
6.50E-07
PASS
4.93E-07
4.13E-08
6.06E-07
3.80E-07
-7.00E-07
PASS
7.00E-07
PASS
4.74E-07
4.11E-08
5.86E-07
3.61E-07
-7.50E-07
PASS
7.50E-07
PASS
4.93E-07
4.13E-08
6.06E-07
3.80E-07
-7.50E-07
PASS
7.50E-07
PASS
5.24E-07
4.47E-08
6.46E-07
4.01E-07
-8.00E-07
PASS
8.00E-07
PASS
5.20E-07
4.33E-08
6.39E-07
4.02E-07
-8.00E-07
PASS
8.00E-07
PASS
4.79E-07
4.04E-08
5.90E-07
3.68E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
276
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=3V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.135. Plot of Negative Input Bias Current @ 3V, VCM=3V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
277
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.135. Raw data for Negative Input Bias Current @ 3V, VCM=3V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=3V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.32E-07
4.60E-07
4.29E-07
4.37E-07
4.51E-07
3.58E-07
4.16E-07
4.51E-07
4.20E-07
3.91E-07
3.89E-07
10
4.93E-07
5.02E-07
4.65E-07
4.80E-07
4.94E-07
4.37E-07
4.96E-07
5.42E-07
5.14E-07
4.82E-07
3.89E-07
20
4.80E-07
4.94E-07
4.56E-07
4.70E-07
4.86E-07
4.19E-07
4.77E-07
5.24E-07
4.94E-07
4.64E-07
3.91E-07
30
4.93E-07
5.02E-07
4.65E-07
4.80E-07
4.94E-07
4.37E-07
4.96E-07
5.42E-07
5.14E-07
4.82E-07
3.89E-07
50
5.19E-07
5.20E-07
4.81E-07
4.97E-07
5.11E-07
4.65E-07
5.26E-07
5.75E-07
5.45E-07
5.16E-07
3.93E-07
60
5.15E-07
5.19E-07
4.78E-07
4.95E-07
5.09E-07
4.61E-07
5.23E-07
5.71E-07
5.42E-07
5.11E-07
3.90E-07
70
4.83E-07
4.99E-07
4.62E-07
4.73E-07
4.90E-07
4.26E-07
4.80E-07
5.28E-07
4.96E-07
4.70E-07
3.91E-07
4.42E-07
1.32E-08
4.78E-07
4.06E-07
4.87E-07
1.45E-08
5.27E-07
4.47E-07
4.77E-07
1.47E-08
5.18E-07
4.37E-07
4.87E-07
1.45E-08
5.27E-07
4.47E-07
5.06E-07
1.66E-08
5.51E-07
4.60E-07
5.03E-07
1.67E-08
5.49E-07
4.57E-07
4.81E-07
1.43E-08
5.21E-07
4.42E-07
4.07E-07
3.49E-08
5.03E-07
3.12E-07
-6.50E-07
PASS
6.50E-07
PASS
4.94E-07
3.92E-08
6.02E-07
3.87E-07
-7.00E-07
PASS
7.00E-07
PASS
4.76E-07
3.89E-08
5.83E-07
3.69E-07
-7.50E-07
PASS
7.50E-07
PASS
4.94E-07
3.92E-08
6.02E-07
3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
5.25E-07
4.06E-08
6.37E-07
4.14E-07
-8.00E-07
PASS
8.00E-07
PASS
5.22E-07
4.10E-08
6.34E-07
4.09E-07
-8.00E-07
PASS
8.00E-07
PASS
4.80E-07
3.74E-08
5.83E-07
3.78E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
278
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 3V, VCM=3V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.136. Plot of Negative Input Bias Current @ 3V, VCM=3V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
279
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.136. Raw data for Negative Input Bias Current @ 3V, VCM=3V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 3V, VCM=3V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.70E-07
3.79E-07
3.78E-07
4.23E-07
4.23E-07
4.46E-07
4.12E-07
3.85E-07
4.11E-07
3.87E-07
4.48E-07
10
5.33E-07
4.22E-07
4.15E-07
4.55E-07
4.57E-07
5.32E-07
5.02E-07
4.70E-07
5.04E-07
4.67E-07
4.49E-07
20
5.20E-07
4.13E-07
4.09E-07
4.48E-07
4.50E-07
5.11E-07
4.84E-07
4.51E-07
4.84E-07
4.50E-07
4.51E-07
30
5.33E-07
4.22E-07
4.15E-07
4.55E-07
4.57E-07
5.32E-07
5.02E-07
4.70E-07
5.04E-07
4.67E-07
4.49E-07
50
5.59E-07
4.41E-07
4.32E-07
4.70E-07
4.71E-07
5.62E-07
5.35E-07
5.00E-07
5.34E-07
4.98E-07
4.50E-07
60
5.56E-07
4.39E-07
4.28E-07
4.67E-07
4.68E-07
5.56E-07
5.29E-07
4.96E-07
5.30E-07
4.92E-07
4.50E-07
70
5.24E-07
4.19E-07
4.11E-07
4.52E-07
4.52E-07
5.15E-07
4.84E-07
4.56E-07
4.86E-07
4.56E-07
4.50E-07
4.15E-07
3.81E-08
5.19E-07
3.10E-07
4.56E-07
4.69E-08
5.85E-07
3.28E-07
4.48E-07
4.43E-08
5.69E-07
3.26E-07
4.56E-07
4.69E-08
5.85E-07
3.28E-07
4.74E-07
5.02E-08
6.12E-07
3.37E-07
4.72E-07
5.00E-08
6.09E-07
3.34E-07
4.52E-07
4.47E-08
5.74E-07
3.29E-07
4.08E-07
2.46E-08
4.75E-07
3.41E-07
-6.50E-07
PASS
6.50E-07
PASS
4.95E-07
2.68E-08
5.69E-07
4.21E-07
-7.00E-07
PASS
7.00E-07
PASS
4.76E-07
2.57E-08
5.47E-07
4.06E-07
-7.50E-07
PASS
7.50E-07
PASS
4.95E-07
2.68E-08
5.69E-07
4.21E-07
-7.50E-07
PASS
7.50E-07
PASS
5.26E-07
2.71E-08
6.00E-07
4.51E-07
-8.00E-07
PASS
8.00E-07
PASS
5.21E-07
2.65E-08
5.93E-07
4.48E-07
-8.00E-07
PASS
8.00E-07
PASS
4.80E-07
2.46E-08
5.47E-07
4.12E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
280
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #1 (V/mV)
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.137. Plot of Large Signal Voltage Gain @ 3V #1 (V/mV) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
281
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.137. Raw data for Large Signal Voltage Gain @ 3V #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #1 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.38E+03
1.46E+03
2.08E+03
1.44E+03
1.71E+03
1.54E+03
1.35E+03
1.29E+03
1.27E+03
1.37E+03
1.67E+03
10
1.28E+03
1.52E+03
1.56E+03
1.05E+03
1.43E+03
1.32E+03
1.21E+03
1.34E+03
1.30E+03
1.66E+03
1.55E+03
20
1.16E+03
1.60E+03
1.58E+03
1.24E+03
1.57E+03
1.36E+03
1.09E+03
1.78E+03
1.25E+03
1.65E+03
1.52E+03
30
1.28E+03
1.52E+03
1.56E+03
1.05E+03
1.43E+03
1.32E+03
1.21E+03
1.34E+03
1.30E+03
1.66E+03
1.55E+03
50
8.87E+02
1.18E+03
1.32E+03
7.31E+02
1.14E+03
1.78E+03
1.37E+03
1.48E+03
1.21E+03
1.23E+03
1.49E+03
60
8.33E+02
1.10E+03
1.39E+03
8.51E+02
1.12E+03
1.18E+03
1.23E+03
1.38E+03
1.20E+03
1.25E+03
1.71E+03
70
1.14E+03
1.45E+03
1.52E+03
1.25E+03
1.52E+03
1.44E+03
1.40E+03
1.51E+03
1.10E+03
1.22E+03
1.42E+03
1.61E+03
2.91E+02
2.41E+03
8.15E+02
1.37E+03
2.06E+02
1.93E+03
8.01E+02
1.43E+03
2.11E+02
2.01E+03
8.53E+02
1.37E+03
2.06E+02
1.93E+03
8.01E+02
1.05E+03
2.40E+02
1.71E+03
3.96E+02
1.06E+03
2.30E+02
1.69E+03
4.28E+02
1.38E+03
1.73E+02
1.85E+03
9.01E+02
1.36E+03
1.07E+02
1.65E+03
1.07E+03
5.00E+02
PASS
1.36E+03
1.73E+02
1.84E+03
8.91E+02
3.00E+02
PASS
1.43E+03
2.83E+02
2.20E+03
6.49E+02
3.00E+02
PASS
1.36E+03
1.73E+02
1.84E+03
8.91E+02
3.00E+02
PASS
1.41E+03
2.34E+02
2.06E+03
7.72E+02
3.00E+02
PASS
1.25E+03
7.82E+01
1.46E+03
1.03E+03
3.00E+02
PASS
1.33E+03
1.67E+02
1.79E+03
8.75E+02
3.00E+02
PASS
An ISO 9001:2000 Certified Company
282
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #2 (V/mV)
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.138. Plot of Large Signal Voltage Gain @ 3V #2 (V/mV) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
283
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.138. Raw data for Large Signal Voltage Gain @ 3V #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #2 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.28E+03
1.45E+03
1.57E+03
1.63E+03
1.48E+03
1.91E+03
1.45E+03
1.77E+03
1.58E+03
1.47E+03
1.50E+03
10
1.31E+03
1.25E+03
1.09E+03
1.30E+03
1.28E+03
1.68E+03
2.07E+03
1.75E+03
1.52E+03
1.50E+03
1.92E+03
20
1.17E+03
1.30E+03
1.34E+03
1.43E+03
1.14E+03
1.32E+03
1.27E+03
9.69E+02
1.32E+03
1.14E+03
1.79E+03
30
1.31E+03
1.25E+03
1.09E+03
1.30E+03
1.28E+03
1.68E+03
2.07E+03
1.75E+03
1.52E+03
1.50E+03
1.92E+03
50
7.99E+02
7.65E+02
7.67E+02
7.26E+02
7.73E+02
2.26E+03
1.22E+03
1.48E+03
1.35E+03
1.45E+03
1.55E+03
60
8.41E+02
8.72E+02
7.38E+02
6.41E+02
8.04E+02
1.99E+03
2.97E+03
1.67E+03
1.68E+03
1.62E+03
1.36E+03
70
1.02E+03
1.29E+03
1.21E+03
1.63E+03
1.25E+03
1.76E+03
1.48E+03
1.48E+03
1.61E+03
2.55E+03
1.85E+03
1.48E+03
1.37E+02
1.86E+03
1.11E+03
1.24E+03
8.90E+01
1.49E+03
9.99E+02
1.28E+03
1.20E+02
1.61E+03
9.48E+02
1.24E+03
8.90E+01
1.49E+03
9.99E+02
7.66E+02
2.62E+01
8.38E+02
6.94E+02
7.79E+02
9.20E+01
1.03E+03
5.27E+02
1.28E+03
2.22E+02
1.89E+03
6.69E+02
1.63E+03
1.97E+02
2.18E+03
1.09E+03
5.00E+02
PASS
1.70E+03
2.29E+02
2.33E+03
1.08E+03
3.00E+02
PASS
1.20E+03
1.49E+02
1.61E+03
7.93E+02
3.00E+02
PASS
1.70E+03
2.29E+02
2.33E+03
1.08E+03
3.00E+02
PASS
1.55E+03
4.07E+02
2.67E+03
4.34E+02
3.00E+02
PASS
1.99E+03
5.70E+02
3.55E+03
4.23E+02
3.00E+02
PASS
1.78E+03
4.49E+02
3.01E+03
5.46E+02
3.00E+02
PASS
An ISO 9001:2000 Certified Company
284
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #3 (V/mV)
2.00E+03
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.139. Plot of Large Signal Voltage Gain @ 3V #3 (V/mV) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
285
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.139. Raw data for Large Signal Voltage Gain @ 3V #3 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #3 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.60E+03
1.70E+03
1.72E+03
2.34E+03
1.54E+03
1.47E+03
1.25E+03
1.56E+03
1.62E+03
1.45E+03
1.54E+03
10
1.03E+03
1.59E+03
1.23E+03
1.34E+03
1.79E+03
1.38E+03
1.33E+03
1.20E+03
1.68E+03
1.32E+03
1.66E+03
20
1.60E+03
1.36E+03
1.39E+03
1.12E+03
1.57E+03
1.40E+03
1.46E+03
1.53E+03
1.41E+03
1.36E+03
1.50E+03
30
1.03E+03
1.59E+03
1.23E+03
1.34E+03
1.79E+03
1.38E+03
1.33E+03
1.20E+03
1.68E+03
1.32E+03
1.66E+03
50
1.06E+03
1.01E+03
9.79E+02
6.47E+02
8.80E+02
1.82E+03
1.20E+03
1.48E+03
1.15E+03
1.27E+03
1.66E+03
60
9.88E+02
1.13E+03
7.92E+02
6.03E+02
1.03E+03
1.54E+03
1.01E+03
1.25E+03
1.85E+03
1.69E+03
1.44E+03
70
1.81E+03
1.67E+03
1.34E+03
1.43E+03
1.14E+03
1.31E+03
1.08E+03
1.29E+03
1.38E+03
1.37E+03
1.57E+03
1.78E+03
3.20E+02
2.66E+03
9.00E+02
1.40E+03
3.01E+02
2.22E+03
5.71E+02
1.41E+03
1.93E+02
1.93E+03
8.79E+02
1.40E+03
3.01E+02
2.22E+03
5.71E+02
9.15E+02
1.64E+02
1.36E+03
4.66E+02
9.09E+02
2.11E+02
1.49E+03
3.31E+02
1.48E+03
2.67E+02
2.21E+03
7.46E+02
1.47E+03
1.40E+02
1.85E+03
1.09E+03
5.00E+02
PASS
1.38E+03
1.78E+02
1.87E+03
8.96E+02
3.00E+02
PASS
1.43E+03
6.49E+01
1.61E+03
1.25E+03
3.00E+02
PASS
1.38E+03
1.78E+02
1.87E+03
8.96E+02
3.00E+02
PASS
1.38E+03
2.74E+02
2.13E+03
6.32E+02
3.00E+02
PASS
1.47E+03
3.41E+02
2.40E+03
5.33E+02
3.00E+02
PASS
1.29E+03
1.21E+02
1.62E+03
9.55E+02
3.00E+02
PASS
An ISO 9001:2000 Certified Company
286
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #4 (V/mV)
1.80E+03
1.60E+03
1.40E+03
1.20E+03
1.00E+03
8.00E+02
6.00E+02
4.00E+02
2.00E+02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.140. Plot of Large Signal Voltage Gain @ 3V #4 (V/mV) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
287
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.140. Raw data for Large Signal Voltage Gain @ 3V #4 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #4 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.40E+03
1.58E+03
1.91E+03
1.39E+03
1.42E+03
1.37E+03
1.48E+03
1.43E+03
1.70E+03
1.75E+03
1.92E+03
10
1.10E+03
1.15E+03
1.21E+03
1.28E+03
1.09E+03
1.30E+03
1.29E+03
1.20E+03
1.43E+03
1.46E+03
1.52E+03
20
1.29E+03
1.20E+03
1.20E+03
1.12E+03
1.25E+03
1.28E+03
1.48E+03
1.32E+03
1.59E+03
1.28E+03
1.67E+03
30
1.10E+03
1.15E+03
1.21E+03
1.28E+03
1.09E+03
1.30E+03
1.29E+03
1.20E+03
1.43E+03
1.46E+03
1.52E+03
50
1.07E+03
8.38E+02
6.76E+02
1.08E+03
1.01E+03
1.21E+03
1.26E+03
1.56E+03
1.50E+03
1.38E+03
1.47E+03
60
9.41E+02
8.80E+02
1.54E+03
1.07E+03
9.37E+02
1.59E+03
1.59E+03
1.41E+03
1.35E+03
1.31E+03
1.61E+03
70
1.02E+03
1.21E+03
1.27E+03
1.33E+03
1.19E+03
1.34E+03
1.34E+03
1.28E+03
1.26E+03
1.30E+03
1.53E+03
1.54E+03
2.22E+02
2.15E+03
9.31E+02
1.17E+03
8.02E+01
1.39E+03
9.46E+02
1.21E+03
6.49E+01
1.39E+03
1.03E+03
1.17E+03
8.02E+01
1.39E+03
9.46E+02
9.36E+02
1.76E+02
1.42E+03
4.55E+02
1.07E+03
2.71E+02
1.82E+03
3.30E+02
1.21E+03
1.18E+02
1.53E+03
8.80E+02
1.55E+03
1.69E+02
2.01E+03
1.08E+03
5.00E+02
PASS
1.34E+03
1.09E+02
1.64E+03
1.04E+03
3.00E+02
PASS
1.39E+03
1.41E+02
1.78E+03
1.00E+03
3.00E+02
PASS
1.34E+03
1.09E+02
1.64E+03
1.04E+03
3.00E+02
PASS
1.38E+03
1.51E+02
1.80E+03
9.67E+02
3.00E+02
PASS
1.45E+03
1.32E+02
1.81E+03
1.09E+03
3.00E+02
PASS
1.30E+03
3.76E+01
1.41E+03
1.20E+03
3.00E+02
PASS
An ISO 9001:2000 Certified Company
288
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #1 (dB)
1.26E+02
1.24E+02
1.22E+02
1.20E+02
1.18E+02
1.16E+02
1.14E+02
1.12E+02
1.10E+02
1.08E+02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.141. Plot of Large Signal Voltage Gain @ 3V #1 (dB) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
289
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.141. Raw data for Large Signal Voltage Gain @ 3V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
0
1.23E+02
1.23E+02
1.26E+02
1.23E+02
1.25E+02
1.24E+02
1.23E+02
1.22E+02
1.22E+02
1.23E+02
1.24E+02
10
1.22E+02
1.24E+02
1.24E+02
1.20E+02
1.23E+02
1.22E+02
1.22E+02
1.23E+02
1.22E+02
1.24E+02
1.24E+02
20
1.21E+02
1.24E+02
1.24E+02
1.22E+02
1.24E+02
1.23E+02
1.21E+02
1.25E+02
1.22E+02
1.24E+02
1.24E+02
30
1.22E+02
1.24E+02
1.24E+02
1.20E+02
1.23E+02
1.22E+02
1.22E+02
1.23E+02
1.22E+02
1.24E+02
1.24E+02
50
1.19E+02
1.21E+02
1.22E+02
1.17E+02
1.21E+02
1.25E+02
1.23E+02
1.23E+02
1.22E+02
1.22E+02
1.23E+02
24 hr
Anneal
60
1.18E+02
1.21E+02
1.23E+02
1.19E+02
1.21E+02
1.21E+02
1.22E+02
1.23E+02
1.22E+02
1.22E+02
1.25E+02
1.24E+02
1.48E+00
1.28E+02
1.20E+02
1.23E+02
1.39E+00
1.26E+02
1.19E+02
1.23E+02
1.33E+00
1.27E+02
1.19E+02
1.23E+02
1.39E+00
1.26E+02
1.19E+02
1.20E+02
2.10E+00
1.26E+02
1.15E+02
1.20E+02
1.86E+00
1.25E+02
1.15E+02
1.23E+02
1.13E+00
1.26E+02
1.20E+02
1.23E+02
6.60E-01
1.24E+02
1.21E+02
1.14E+02
PASS
1.23E+02
1.04E+00
1.25E+02
1.20E+02
1.10E+02
PASS
1.23E+02
1.73E+00
1.28E+02
1.18E+02
1.10E+02
PASS
1.23E+02
1.04E+00
1.25E+02
1.20E+02
1.10E+02
PASS
1.23E+02
1.38E+00
1.27E+02
1.19E+02
1.10E+02
PASS
1.22E+02
5.29E-01
1.23E+02
1.20E+02
1.10E+02
PASS
1.22E+02
1.12E+00
1.26E+02
1.19E+02
1.10E+02
PASS
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
An ISO 9001:2000 Certified Company
290
168 hr
Anneal
70
1.21E+02
1.23E+02
1.24E+02
1.22E+02
1.24E+02
1.23E+02
1.23E+02
1.24E+02
1.21E+02
1.22E+02
1.23E+02
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #2 (dB)
1.28E+02
1.26E+02
1.24E+02
1.22E+02
1.20E+02
1.18E+02
1.16E+02
1.14E+02
1.12E+02
1.10E+02
1.08E+02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.142. Plot of Large Signal Voltage Gain @ 3V #2 (dB) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
291
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.142. Raw data for Large Signal Voltage Gain @ 3V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
0
1.22E+02
1.23E+02
1.24E+02
1.24E+02
1.23E+02
1.26E+02
1.23E+02
1.25E+02
1.24E+02
1.23E+02
1.24E+02
10
1.22E+02
1.22E+02
1.21E+02
1.22E+02
1.22E+02
1.25E+02
1.26E+02
1.25E+02
1.24E+02
1.24E+02
1.26E+02
20
1.21E+02
1.22E+02
1.23E+02
1.23E+02
1.21E+02
1.22E+02
1.22E+02
1.20E+02
1.22E+02
1.21E+02
1.25E+02
30
1.22E+02
1.22E+02
1.21E+02
1.22E+02
1.22E+02
1.25E+02
1.26E+02
1.25E+02
1.24E+02
1.24E+02
1.26E+02
50
1.18E+02
1.18E+02
1.18E+02
1.17E+02
1.18E+02
1.27E+02
1.22E+02
1.23E+02
1.23E+02
1.23E+02
1.24E+02
24 hr
Anneal
60
1.18E+02
1.19E+02
1.17E+02
1.16E+02
1.18E+02
1.26E+02
1.29E+02
1.24E+02
1.25E+02
1.24E+02
1.23E+02
1.23E+02
8.23E-01
1.26E+02
1.21E+02
1.22E+02
6.50E-01
1.24E+02
1.20E+02
1.22E+02
8.18E-01
1.24E+02
1.20E+02
1.22E+02
6.50E-01
1.24E+02
1.20E+02
1.18E+02
2.99E-01
1.19E+02
1.17E+02
1.18E+02
1.07E+00
1.21E+02
1.15E+02
1.22E+02
1.47E+00
1.26E+02
1.18E+02
1.24E+02
1.03E+00
1.27E+02
1.21E+02
1.14E+02
PASS
1.25E+02
1.12E+00
1.28E+02
1.21E+02
1.10E+02
PASS
1.22E+02
1.13E+00
1.25E+02
1.18E+02
1.10E+02
PASS
1.25E+02
1.12E+00
1.28E+02
1.21E+02
1.10E+02
PASS
1.24E+02
2.05E+00
1.29E+02
1.18E+02
1.10E+02
PASS
1.26E+02
2.21E+00
1.32E+02
1.20E+02
1.10E+02
PASS
1.25E+02
1.97E+00
1.30E+02
1.19E+02
1.10E+02
PASS
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
An ISO 9001:2000 Certified Company
292
168 hr
Anneal
70
1.20E+02
1.22E+02
1.22E+02
1.24E+02
1.22E+02
1.25E+02
1.23E+02
1.23E+02
1.24E+02
1.28E+02
1.25E+02
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #3 (dB)
1.26E+02
1.24E+02
1.22E+02
1.20E+02
1.18E+02
1.16E+02
1.14E+02
1.12E+02
1.10E+02
1.08E+02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.143. Plot of Large Signal Voltage Gain @ 3V #3 (dB) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
293
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.143. Raw data for Large Signal Voltage Gain @ 3V #3 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
0
1.24E+02
1.25E+02
1.25E+02
1.27E+02
1.24E+02
1.23E+02
1.22E+02
1.24E+02
1.24E+02
1.23E+02
1.24E+02
10
1.20E+02
1.24E+02
1.22E+02
1.23E+02
1.25E+02
1.23E+02
1.22E+02
1.22E+02
1.25E+02
1.22E+02
1.24E+02
20
1.24E+02
1.23E+02
1.23E+02
1.21E+02
1.24E+02
1.23E+02
1.23E+02
1.24E+02
1.23E+02
1.23E+02
1.24E+02
30
1.20E+02
1.24E+02
1.22E+02
1.23E+02
1.25E+02
1.23E+02
1.22E+02
1.22E+02
1.25E+02
1.22E+02
1.24E+02
50
1.21E+02
1.20E+02
1.20E+02
1.16E+02
1.19E+02
1.25E+02
1.22E+02
1.23E+02
1.21E+02
1.22E+02
1.24E+02
24 hr
Anneal
60
1.20E+02
1.21E+02
1.18E+02
1.16E+02
1.20E+02
1.24E+02
1.20E+02
1.22E+02
1.25E+02
1.25E+02
1.23E+02
1.25E+02
1.44E+00
1.29E+02
1.21E+02
1.23E+02
1.89E+00
1.28E+02
1.18E+02
1.23E+02
1.25E+00
1.26E+02
1.19E+02
1.23E+02
1.89E+00
1.28E+02
1.18E+02
1.19E+02
1.72E+00
1.24E+02
1.14E+02
1.19E+02
2.19E+00
1.25E+02
1.13E+02
1.23E+02
1.59E+00
1.28E+02
1.19E+02
1.23E+02
8.60E-01
1.26E+02
1.21E+02
1.14E+02
PASS
1.23E+02
1.07E+00
1.26E+02
1.20E+02
1.10E+02
PASS
1.23E+02
3.90E-01
1.24E+02
1.22E+02
1.10E+02
PASS
1.23E+02
1.07E+00
1.26E+02
1.20E+02
1.10E+02
PASS
1.23E+02
1.63E+00
1.27E+02
1.18E+02
1.10E+02
PASS
1.23E+02
2.14E+00
1.29E+02
1.17E+02
1.10E+02
PASS
1.22E+02
8.61E-01
1.25E+02
1.20E+02
1.10E+02
PASS
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
An ISO 9001:2000 Certified Company
294
168 hr
Anneal
70
1.25E+02
1.24E+02
1.23E+02
1.23E+02
1.21E+02
1.22E+02
1.21E+02
1.22E+02
1.23E+02
1.23E+02
1.24E+02
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 3V #4 (dB)
1.26E+02
1.24E+02
1.22E+02
1.20E+02
1.18E+02
1.16E+02
1.14E+02
1.12E+02
1.10E+02
1.08E+02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.144. Plot of Large Signal Voltage Gain @ 3V #4 (dB) versus total dose. The data show some
degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification.
The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all pins
tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the
KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
295
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.144. Raw data for Large Signal Voltage Gain @ 3V #4 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
0
1.23E+02
1.24E+02
1.26E+02
1.23E+02
1.23E+02
1.23E+02
1.23E+02
1.23E+02
1.25E+02
1.25E+02
1.26E+02
10
1.21E+02
1.21E+02
1.22E+02
1.22E+02
1.21E+02
1.22E+02
1.22E+02
1.22E+02
1.23E+02
1.23E+02
1.24E+02
20
1.22E+02
1.22E+02
1.22E+02
1.21E+02
1.22E+02
1.22E+02
1.23E+02
1.22E+02
1.24E+02
1.22E+02
1.24E+02
30
1.21E+02
1.21E+02
1.22E+02
1.22E+02
1.21E+02
1.22E+02
1.22E+02
1.22E+02
1.23E+02
1.23E+02
1.24E+02
50
1.21E+02
1.18E+02
1.17E+02
1.21E+02
1.20E+02
1.22E+02
1.22E+02
1.24E+02
1.24E+02
1.23E+02
1.23E+02
24 hr
Anneal
60
1.19E+02
1.19E+02
1.24E+02
1.21E+02
1.19E+02
1.24E+02
1.24E+02
1.23E+02
1.23E+02
1.22E+02
1.24E+02
1.24E+02
1.18E+00
1.27E+02
1.20E+02
1.21E+02
5.91E-01
1.23E+02
1.20E+02
1.22E+02
4.70E-01
1.23E+02
1.20E+02
1.21E+02
5.91E-01
1.23E+02
1.20E+02
1.19E+02
1.75E+00
1.24E+02
1.14E+02
1.20E+02
1.96E+00
1.26E+02
1.15E+02
1.22E+02
8.88E-01
1.24E+02
1.19E+02
1.24E+02
9.43E-01
1.26E+02
1.21E+02
1.14E+02
PASS
1.23E+02
7.07E-01
1.24E+02
1.21E+02
1.10E+02
PASS
1.23E+02
8.60E-01
1.25E+02
1.20E+02
1.10E+02
PASS
1.23E+02
7.07E-01
1.24E+02
1.21E+02
1.10E+02
PASS
1.23E+02
9.52E-01
1.25E+02
1.20E+02
1.10E+02
PASS
1.23E+02
7.89E-01
1.25E+02
1.21E+02
1.10E+02
PASS
1.22E+02
2.51E-01
1.23E+02
1.22E+02
1.10E+02
PASS
Total Dose (krad(Si))
Large Signal Voltage Gain @ 3V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
An ISO 9001:2000 Certified Company
296
168 hr
Anneal
70
1.20E+02
1.22E+02
1.22E+02
1.22E+02
1.22E+02
1.23E+02
1.23E+02
1.22E+02
1.22E+02
1.22E+02
1.24E+02
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ 3V #1 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.145. Plot of Common Mode Rejection Ratio @ 3V #1 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
297
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.145. Raw data for Common Mode Rejection Ratio @ 3V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 3V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
7.89E+01
1.02E+02
8.11E+01
8.64E+01
1.05E+02
8.31E+01
8.30E+01
8.91E+01
8.00E+01
9.01E+01
9.57E+01
10
7.93E+01
1.00E+02
8.09E+01
8.65E+01
1.02E+02
8.27E+01
8.29E+01
9.00E+01
7.97E+01
9.12E+01
9.53E+01
20
7.92E+01
1.00E+02
8.10E+01
8.65E+01
1.00E+02
8.29E+01
8.29E+01
9.00E+01
7.98E+01
9.12E+01
9.51E+01
30
7.93E+01
1.00E+02
8.09E+01
8.65E+01
1.02E+02
8.27E+01
8.29E+01
9.00E+01
7.97E+01
9.12E+01
9.53E+01
50
7.94E+01
1.00E+02
8.09E+01
8.66E+01
1.02E+02
8.27E+01
8.29E+01
8.99E+01
7.97E+01
9.14E+01
9.54E+01
60
7.94E+01
1.00E+02
8.09E+01
8.66E+01
1.03E+02
8.27E+01
8.29E+01
9.00E+01
7.97E+01
9.13E+01
9.56E+01
70
7.97E+01
1.01E+02
8.09E+01
8.71E+01
9.79E+01
8.35E+01
8.26E+01
9.03E+01
7.98E+01
9.52E+01
9.53E+01
9.07E+01
1.20E+01
1.24E+02
5.77E+01
8.97E+01
1.06E+01
1.19E+02
6.06E+01
8.94E+01
1.02E+01
1.17E+02
6.15E+01
8.97E+01
1.06E+01
1.19E+02
6.06E+01
8.98E+01
1.06E+01
1.19E+02
6.07E+01
9.00E+01
1.09E+01
1.20E+02
6.01E+01
8.92E+01
9.59E+00
1.16E+02
6.30E+01
8.51E+01
4.33E+00
9.69E+01
7.32E+01
7.20E+01
FAIL
8.53E+01
5.01E+00
9.90E+01
7.16E+01
7.00E+01
FAIL
8.53E+01
4.98E+00
9.90E+01
7.17E+01
7.00E+01
FAIL
8.53E+01
5.01E+00
9.90E+01
7.16E+01
7.00E+01
FAIL
8.53E+01
5.06E+00
9.92E+01
7.14E+01
7.00E+01
FAIL
8.53E+01
5.02E+00
9.91E+01
7.15E+01
7.00E+01
FAIL
8.63E+01
6.31E+00
1.04E+02
6.90E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
298
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio @ 3V #2 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.146. Plot of Common Mode Rejection Ratio @ 3V #2 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
299
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.146. Raw data for Common Mode Rejection Ratio @ 3V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 3V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.46E+01
8.46E+01
8.52E+01
7.75E+01
8.17E+01
7.95E+01
8.48E+01
1.34E+02
8.45E+01
8.57E+01
9.18E+01
10
9.61E+01
8.45E+01
8.54E+01
7.78E+01
8.16E+01
7.93E+01
8.42E+01
1.12E+02
8.44E+01
8.55E+01
9.21E+01
20
9.59E+01
8.46E+01
8.54E+01
7.77E+01
8.16E+01
7.93E+01
8.43E+01
1.15E+02
8.46E+01
8.55E+01
9.21E+01
30
9.61E+01
8.45E+01
8.54E+01
7.78E+01
8.16E+01
7.93E+01
8.42E+01
1.12E+02
8.44E+01
8.55E+01
9.21E+01
50
9.67E+01
8.43E+01
8.54E+01
7.79E+01
8.15E+01
7.92E+01
8.41E+01
1.13E+02
8.43E+01
8.54E+01
9.21E+01
60
9.68E+01
8.43E+01
8.55E+01
7.79E+01
8.16E+01
7.93E+01
8.41E+01
1.14E+02
8.45E+01
8.53E+01
9.19E+01
70
9.42E+01
8.52E+01
8.45E+01
7.76E+01
8.23E+01
7.95E+01
8.43E+01
1.17E+02
8.45E+01
8.62E+01
9.23E+01
8.47E+01
6.29E+00
1.02E+02
6.74E+01
8.51E+01
6.85E+00
1.04E+02
6.63E+01
8.50E+01
6.75E+00
1.04E+02
6.65E+01
8.51E+01
6.85E+00
1.04E+02
6.63E+01
8.52E+01
7.05E+00
1.05E+02
6.58E+01
8.52E+01
7.12E+00
1.05E+02
6.57E+01
8.48E+01
6.04E+00
1.01E+02
6.82E+01
9.38E+01
2.28E+01
1.56E+02
3.13E+01
7.20E+01
FAIL
8.91E+01
1.32E+01
1.25E+02
5.31E+01
7.00E+01
FAIL
8.98E+01
1.45E+01
1.30E+02
5.01E+01
7.00E+01
FAIL
8.91E+01
1.32E+01
1.25E+02
5.31E+01
7.00E+01
FAIL
8.91E+01
1.33E+01
1.26E+02
5.26E+01
7.00E+01
FAIL
8.94E+01
1.38E+01
1.27E+02
5.15E+01
7.00E+01
FAIL
9.03E+01
1.52E+01
1.32E+02
4.86E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
300
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ 3V #3 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.147. Plot of Common Mode Rejection Ratio @ 3V #3 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
301
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.147. Raw data for Common Mode Rejection Ratio @ 3V #3 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 3V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.79E+01
7.96E+01
7.84E+01
8.03E+01
9.48E+01
8.73E+01
9.21E+01
7.72E+01
8.64E+01
8.05E+01
7.84E+01
10
8.66E+01
7.99E+01
7.87E+01
8.02E+01
9.37E+01
8.66E+01
9.13E+01
7.71E+01
8.61E+01
8.06E+01
7.85E+01
20
8.68E+01
7.99E+01
7.87E+01
8.02E+01
9.40E+01
8.67E+01
9.15E+01
7.72E+01
8.62E+01
8.05E+01
7.84E+01
30
8.66E+01
7.99E+01
7.87E+01
8.02E+01
9.37E+01
8.66E+01
9.13E+01
7.71E+01
8.61E+01
8.06E+01
7.85E+01
50
8.64E+01
8.01E+01
7.90E+01
8.01E+01
9.32E+01
8.65E+01
9.12E+01
7.72E+01
8.61E+01
8.06E+01
7.84E+01
60
8.64E+01
8.01E+01
7.90E+01
8.01E+01
9.35E+01
8.65E+01
9.14E+01
7.72E+01
8.61E+01
8.06E+01
7.84E+01
70
8.61E+01
8.03E+01
7.86E+01
7.99E+01
9.16E+01
8.75E+01
9.15E+01
7.73E+01
8.63E+01
8.07E+01
7.85E+01
8.42E+01
7.02E+00
1.03E+02
6.50E+01
8.38E+01
6.31E+00
1.01E+02
6.65E+01
8.39E+01
6.45E+00
1.02E+02
6.62E+01
8.38E+01
6.31E+00
1.01E+02
6.65E+01
8.38E+01
6.03E+00
1.00E+02
6.72E+01
8.38E+01
6.15E+00
1.01E+02
6.70E+01
8.33E+01
5.46E+00
9.83E+01
6.83E+01
8.47E+01
5.89E+00
1.01E+02
6.86E+01
7.20E+01
FAIL
8.43E+01
5.54E+00
9.95E+01
6.92E+01
7.00E+01
FAIL
8.44E+01
5.62E+00
9.98E+01
6.90E+01
7.00E+01
FAIL
8.43E+01
5.54E+00
9.95E+01
6.92E+01
7.00E+01
FAIL
8.43E+01
5.49E+00
9.94E+01
6.93E+01
7.00E+01
FAIL
8.43E+01
5.56E+00
9.96E+01
6.91E+01
7.00E+01
FAIL
8.46E+01
5.65E+00
1.00E+02
6.91E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
302
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Common Mode Rejection Ratio @ 3V #4 (dB)
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.148. Plot of Common Mode Rejection Ratio @ 3V #4 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
303
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.148. Raw data for Common Mode Rejection Ratio @ 3V #4 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 3V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.96E+01
8.87E+01
8.41E+01
8.87E+01
1.05E+02
8.46E+01
8.09E+01
7.88E+01
8.02E+01
8.77E+01
9.06E+01
10
9.64E+01
8.85E+01
8.42E+01
8.80E+01
1.14E+02
8.43E+01
8.09E+01
7.84E+01
8.00E+01
8.72E+01
9.06E+01
20
9.65E+01
8.86E+01
8.42E+01
8.82E+01
1.12E+02
8.43E+01
8.09E+01
7.85E+01
8.00E+01
8.73E+01
9.04E+01
30
9.64E+01
8.85E+01
8.42E+01
8.80E+01
1.14E+02
8.43E+01
8.09E+01
7.84E+01
8.00E+01
8.72E+01
9.06E+01
50
9.59E+01
8.87E+01
8.42E+01
8.79E+01
1.19E+02
8.42E+01
8.09E+01
7.83E+01
7.99E+01
8.72E+01
9.06E+01
60
9.61E+01
8.87E+01
8.41E+01
8.79E+01
1.15E+02
8.42E+01
8.09E+01
7.84E+01
7.99E+01
8.72E+01
9.07E+01
70
9.52E+01
8.84E+01
8.33E+01
8.80E+01
1.26E+02
8.43E+01
8.03E+01
7.83E+01
7.98E+01
8.77E+01
9.05E+01
9.33E+01
8.80E+00
1.17E+02
6.92E+01
9.42E+01
1.18E+01
1.27E+02
6.17E+01
9.39E+01
1.10E+01
1.24E+02
6.38E+01
9.42E+01
1.18E+01
1.27E+02
6.17E+01
9.52E+01
1.42E+01
1.34E+02
5.64E+01
9.43E+01
1.22E+01
1.28E+02
6.09E+01
9.61E+01
1.70E+01
1.43E+02
4.94E+01
8.24E+01
3.65E+00
9.25E+01
7.24E+01
7.20E+01
FAIL
8.22E+01
3.55E+00
9.19E+01
7.24E+01
7.00E+01
FAIL
8.22E+01
3.55E+00
9.20E+01
7.25E+01
7.00E+01
FAIL
8.22E+01
3.55E+00
9.19E+01
7.24E+01
7.00E+01
FAIL
8.21E+01
3.58E+00
9.19E+01
7.23E+01
7.00E+01
FAIL
8.21E+01
3.56E+00
9.19E+01
7.24E+01
7.00E+01
FAIL
8.21E+01
3.84E+00
9.26E+01
7.15E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
304
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching 1-4 @ 3V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.149. Plot of Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
305
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.149. Raw data for Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching 1-4 @ 3V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
7.98E+01
9.07E+01
9.17E+01
9.92E+01
9.89E+01
9.87E+01
9.44E+01
7.65E+01
1.16E+02
8.28E+01
9.76E+01
10
8.06E+01
9.12E+01
9.10E+01
1.03E+02
9.99E+01
9.85E+01
9.48E+01
7.64E+01
1.10E+02
8.30E+01
9.80E+01
20
8.05E+01
9.12E+01
9.12E+01
1.01E+02
9.81E+01
9.89E+01
9.48E+01
7.64E+01
1.11E+02
8.30E+01
9.79E+01
30
8.06E+01
9.12E+01
9.10E+01
1.03E+02
9.99E+01
9.85E+01
9.48E+01
7.64E+01
1.10E+02
8.30E+01
9.80E+01
50
8.08E+01
9.14E+01
9.08E+01
1.04E+02
1.01E+02
9.84E+01
9.46E+01
7.63E+01
1.12E+02
8.31E+01
9.80E+01
60
8.07E+01
9.13E+01
9.10E+01
1.04E+02
1.01E+02
9.88E+01
9.45E+01
7.63E+01
1.11E+02
8.30E+01
9.81E+01
70
8.13E+01
9.09E+01
9.34E+01
1.08E+02
9.76E+01
1.05E+02
9.31E+01
7.63E+01
1.29E+02
8.46E+01
9.78E+01
9.21E+01
7.92E+00
1.14E+02
7.03E+01
9.31E+01
8.66E+00
1.17E+02
6.93E+01
9.25E+01
8.02E+00
1.14E+02
7.05E+01
9.31E+01
8.66E+00
1.17E+02
6.93E+01
9.36E+01
9.22E+00
1.19E+02
6.83E+01
9.35E+01
9.13E+00
1.19E+02
6.85E+01
9.42E+01
9.67E+00
1.21E+02
6.77E+01
9.37E+01
1.53E+01
1.36E+02
5.16E+01
7.00E+01
FAIL
9.25E+01
1.32E+01
1.29E+02
5.63E+01
7.00E+01
FAIL
9.27E+01
1.34E+01
1.30E+02
5.60E+01
7.00E+01
FAIL
9.25E+01
1.32E+01
1.29E+02
5.63E+01
7.00E+01
FAIL
9.29E+01
1.39E+01
1.31E+02
5.47E+01
7.00E+01
FAIL
9.27E+01
1.36E+01
1.30E+02
5.54E+01
7.00E+01
FAIL
9.75E+01
2.04E+01
1.53E+02
4.17E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
306
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching 2-3 @ 3V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.150. Plot of Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
307
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.150. Raw data for Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching 2-3 @ 3V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.46E+01
8.69E+01
8.37E+01
8.88E+01
8.38E+01
8.41E+01
8.98E+01
7.72E+01
9.86E+01
8.74E+01
8.05E+01
10
8.41E+01
8.77E+01
8.42E+01
9.02E+01
8.40E+01
8.41E+01
8.93E+01
7.73E+01
9.94E+01
8.78E+01
8.05E+01
20
8.42E+01
8.76E+01
8.40E+01
8.99E+01
8.40E+01
8.41E+01
8.93E+01
7.73E+01
1.00E+02
8.78E+01
8.05E+01
30
8.41E+01
8.77E+01
8.42E+01
9.02E+01
8.40E+01
8.41E+01
8.93E+01
7.73E+01
9.94E+01
8.78E+01
8.05E+01
50
8.40E+01
8.84E+01
8.47E+01
9.08E+01
8.42E+01
8.42E+01
8.91E+01
7.74E+01
9.86E+01
8.80E+01
8.04E+01
60
8.41E+01
8.84E+01
8.45E+01
9.08E+01
8.42E+01
8.42E+01
8.90E+01
7.73E+01
9.96E+01
8.81E+01
8.05E+01
70
8.32E+01
8.75E+01
8.47E+01
9.04E+01
8.59E+01
8.40E+01
8.92E+01
7.72E+01
9.90E+01
8.73E+01
8.04E+01
8.55E+01
2.20E+00
9.16E+01
7.95E+01
8.60E+01
2.80E+00
9.37E+01
7.84E+01
8.59E+01
2.68E+00
9.33E+01
7.86E+01
8.60E+01
2.80E+00
9.37E+01
7.84E+01
8.64E+01
3.04E+00
9.47E+01
7.81E+01
8.64E+01
3.05E+00
9.48E+01
7.81E+01
8.63E+01
2.74E+00
9.39E+01
7.88E+01
8.74E+01
7.84E+00
1.09E+02
6.59E+01
7.00E+01
FAIL
8.76E+01
8.07E+00
1.10E+02
6.55E+01
7.00E+01
FAIL
8.77E+01
8.34E+00
1.11E+02
6.49E+01
7.00E+01
FAIL
8.76E+01
8.07E+00
1.10E+02
6.55E+01
7.00E+01
FAIL
8.74E+01
7.76E+00
1.09E+02
6.62E+01
7.00E+01
FAIL
8.77E+01
8.14E+00
1.10E+02
6.53E+01
7.00E+01
FAIL
8.73E+01
7.96E+00
1.09E+02
6.55E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
308
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.151. Plot of Output Voltage Swing High IL= 0mA @ 3V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
309
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.151. Raw data for Output Voltage Swing High IL= 0mA @ 3V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.02E-03
3.83E-03
3.72E-03
3.63E-03
3.78E-03
3.83E-03
3.78E-03
3.73E-03
3.68E-03
3.85E-03
3.97E-03
10
3.96E-03
3.71E-03
3.53E-03
3.68E-03
3.78E-03
4.10E-03
3.88E-03
3.91E-03
3.78E-03
3.88E-03
3.95E-03
20
3.94E-03
3.72E-03
3.69E-03
3.60E-03
3.75E-03
3.81E-03
3.84E-03
3.84E-03
3.74E-03
3.65E-03
3.86E-03
30
3.96E-03
3.71E-03
3.53E-03
3.68E-03
3.78E-03
4.10E-03
3.88E-03
3.91E-03
3.78E-03
3.88E-03
3.95E-03
50
4.02E-03
3.65E-03
3.55E-03
3.83E-03
3.77E-03
3.93E-03
3.77E-03
3.90E-03
3.72E-03
4.02E-03
3.99E-03
60
3.99E-03
3.69E-03
3.62E-03
3.80E-03
3.84E-03
3.94E-03
3.97E-03
4.01E-03
3.87E-03
3.89E-03
3.89E-03
70
3.76E-03
3.73E-03
3.54E-03
3.68E-03
3.47E-03
3.90E-03
3.85E-03
3.81E-03
3.51E-03
3.81E-03
3.76E-03
3.80E-03
1.46E-04
4.20E-03
3.40E-03
3.73E-03
1.57E-04
4.16E-03
3.30E-03
3.74E-03
1.25E-04
4.08E-03
3.40E-03
3.73E-03
1.57E-04
4.16E-03
3.30E-03
3.76E-03
1.79E-04
4.26E-03
3.27E-03
3.79E-03
1.43E-04
4.18E-03
3.40E-03
3.64E-03
1.25E-04
3.98E-03
3.29E-03
3.77E-03
7.02E-05
3.97E-03
3.58E-03
1.00E-02
PASS
3.91E-03
1.17E-04
4.23E-03
3.59E-03
2.00E-02
PASS
3.78E-03
8.14E-05
4.00E-03
3.55E-03
2.00E-02
PASS
3.91E-03
1.17E-04
4.23E-03
3.59E-03
2.00E-02
PASS
3.87E-03
1.22E-04
4.20E-03
3.53E-03
2.00E-02
PASS
3.94E-03
5.73E-05
4.09E-03
3.78E-03
2.00E-02
PASS
3.78E-03
1.53E-04
4.20E-03
3.36E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
310
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.152. Plot of Output Voltage Swing High IL= 0mA @ 3V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
311
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.152. Raw data for Output Voltage Swing High IL= 0mA @ 3V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.73E-03
3.73E-03
3.63E-03
3.80E-03
3.70E-03
3.65E-03
3.92E-03
3.77E-03
3.63E-03
3.92E-03
3.68E-03
10
3.69E-03
3.74E-03
3.61E-03
3.66E-03
3.64E-03
3.76E-03
3.91E-03
3.91E-03
3.76E-03
3.95E-03
3.73E-03
20
3.72E-03
3.75E-03
3.67E-03
3.77E-03
3.75E-03
3.72E-03
3.87E-03
3.70E-03
3.81E-03
3.81E-03
3.75E-03
30
3.69E-03
3.74E-03
3.61E-03
3.66E-03
3.64E-03
3.76E-03
3.91E-03
3.91E-03
3.76E-03
3.95E-03
3.73E-03
50
3.92E-03
3.87E-03
3.58E-03
4.47E-03
3.67E-03
3.82E-03
3.87E-03
3.88E-03
3.85E-03
3.90E-03
3.68E-03
60
4.02E-03
3.84E-03
3.70E-03
4.49E-03
3.79E-03
4.01E-03
3.91E-03
4.04E-03
3.79E-03
3.92E-03
3.80E-03
70
3.54E-03
3.69E-03
3.47E-03
3.74E-03
3.66E-03
3.69E-03
3.74E-03
3.76E-03
3.59E-03
3.78E-03
3.68E-03
3.72E-03
6.14E-05
3.89E-03
3.55E-03
3.67E-03
4.97E-05
3.80E-03
3.53E-03
3.73E-03
3.90E-05
3.84E-03
3.63E-03
3.67E-03
4.97E-05
3.80E-03
3.53E-03
3.90E-03
3.47E-04
4.85E-03
2.95E-03
3.97E-03
3.14E-04
4.83E-03
3.11E-03
3.62E-03
1.12E-04
3.93E-03
3.31E-03
3.78E-03
1.40E-04
4.16E-03
3.39E-03
1.00E-02
PASS
3.86E-03
9.09E-05
4.11E-03
3.61E-03
2.00E-02
PASS
3.78E-03
7.05E-05
3.98E-03
3.59E-03
2.00E-02
PASS
3.86E-03
9.09E-05
4.11E-03
3.61E-03
2.00E-02
PASS
3.86E-03
3.05E-05
3.95E-03
3.78E-03
2.00E-02
PASS
3.93E-03
9.81E-05
4.20E-03
3.66E-03
2.00E-02
PASS
3.71E-03
7.60E-05
3.92E-03
3.50E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
312
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.153. Plot of Output Voltage Swing High IL= 0mA @ 3V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
313
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.153. Raw data for Output Voltage Swing High IL= 0mA @ 3V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.77E-03
3.78E-03
3.53E-03
3.72E-03
3.66E-03
3.61E-03
3.82E-03
3.80E-03
3.55E-03
3.85E-03
3.70E-03
10
3.88E-03
3.69E-03
3.53E-03
3.71E-03
3.64E-03
3.81E-03
3.83E-03
3.91E-03
3.85E-03
4.03E-03
3.71E-03
20
3.60E-03
3.81E-03
3.86E-03
3.65E-03
3.72E-03
3.82E-03
3.91E-03
3.64E-03
3.59E-03
3.99E-03
3.62E-03
30
3.88E-03
3.69E-03
3.53E-03
3.71E-03
3.64E-03
3.81E-03
3.83E-03
3.91E-03
3.85E-03
4.03E-03
3.71E-03
50
4.04E-03
3.75E-03
3.61E-03
4.56E-03
4.04E-03
3.82E-03
3.92E-03
3.90E-03
3.85E-03
4.00E-03
3.75E-03
60
4.04E-03
3.85E-03
3.65E-03
4.34E-03
4.04E-03
3.89E-03
4.11E-03
3.84E-03
3.99E-03
4.01E-03
3.77E-03
70
3.56E-03
3.78E-03
3.61E-03
3.56E-03
3.56E-03
3.71E-03
3.85E-03
3.79E-03
3.66E-03
3.78E-03
3.64E-03
3.69E-03
1.02E-04
3.97E-03
3.41E-03
3.69E-03
1.27E-04
4.04E-03
3.34E-03
3.73E-03
1.08E-04
4.02E-03
3.43E-03
3.69E-03
1.27E-04
4.04E-03
3.34E-03
4.00E-03
3.64E-04
5.00E-03
3.00E-03
3.98E-03
2.56E-04
4.69E-03
3.28E-03
3.61E-03
9.53E-05
3.88E-03
3.35E-03
3.73E-03
1.36E-04
4.10E-03
3.35E-03
1.00E-02
PASS
3.89E-03
8.88E-05
4.13E-03
3.64E-03
2.00E-02
PASS
3.79E-03
1.72E-04
4.26E-03
3.32E-03
2.00E-02
PASS
3.89E-03
8.88E-05
4.13E-03
3.64E-03
2.00E-02
PASS
3.90E-03
6.94E-05
4.09E-03
3.71E-03
2.00E-02
PASS
3.97E-03
1.06E-04
4.26E-03
3.68E-03
2.00E-02
PASS
3.76E-03
7.40E-05
3.96E-03
3.56E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
314
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.154. Plot of Output Voltage Swing High IL= 0mA @ 3V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
315
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.154. Raw data for Output Voltage Swing High IL= 0mA @ 3V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.78E-03
3.82E-03
3.70E-03
3.73E-03
3.80E-03
3.82E-03
3.83E-03
3.83E-03
3.65E-03
3.73E-03
3.90E-03
10
3.91E-03
3.69E-03
3.68E-03
3.73E-03
3.74E-03
3.86E-03
3.88E-03
3.98E-03
3.85E-03
3.93E-03
3.90E-03
20
3.77E-03
3.77E-03
3.70E-03
3.72E-03
3.89E-03
3.87E-03
3.87E-03
3.92E-03
3.54E-03
3.86E-03
3.82E-03
30
3.91E-03
3.69E-03
3.68E-03
3.73E-03
3.74E-03
3.86E-03
3.88E-03
3.98E-03
3.85E-03
3.93E-03
3.90E-03
50
3.90E-03
3.78E-03
3.65E-03
3.63E-03
3.80E-03
3.99E-03
3.97E-03
3.95E-03
3.87E-03
3.88E-03
3.72E-03
60
3.87E-03
3.77E-03
3.74E-03
3.84E-03
3.85E-03
4.06E-03
4.07E-03
3.99E-03
3.85E-03
3.92E-03
3.79E-03
70
3.71E-03
3.63E-03
3.47E-03
3.68E-03
3.64E-03
3.78E-03
3.81E-03
3.90E-03
3.69E-03
3.88E-03
3.88E-03
3.77E-03
4.98E-05
3.90E-03
3.63E-03
3.75E-03
9.30E-05
4.01E-03
3.49E-03
3.77E-03
7.38E-05
3.97E-03
3.57E-03
3.75E-03
9.30E-05
4.01E-03
3.49E-03
3.75E-03
1.12E-04
4.06E-03
3.44E-03
3.81E-03
5.59E-05
3.97E-03
3.66E-03
3.63E-03
9.29E-05
3.88E-03
3.37E-03
3.77E-03
8.01E-05
3.99E-03
3.55E-03
1.00E-02
PASS
3.90E-03
5.43E-05
4.05E-03
3.75E-03
2.00E-02
PASS
3.81E-03
1.54E-04
4.23E-03
3.39E-03
2.00E-02
PASS
3.90E-03
5.43E-05
4.05E-03
3.75E-03
2.00E-02
PASS
3.93E-03
5.40E-05
4.08E-03
3.78E-03
2.00E-02
PASS
3.98E-03
9.36E-05
4.23E-03
3.72E-03
2.00E-02
PASS
3.81E-03
8.41E-05
4.04E-03
3.58E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
316
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.155. Plot of Output Voltage Swing High IL= 1mA @ 3V #1 (V) versus total dose. The data show a
significant change with radiation, however it is not sufficient for any of the units-under-test to exceed
specification (including after application of the KTL statistics). The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
317
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.155. Raw data for Output Voltage Swing High IL= 1mA @ 3V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.99E-02
6.78E-02
6.81E-02
6.72E-02
6.78E-02
6.95E-02
6.75E-02
6.82E-02
6.73E-02
6.89E-02
6.88E-02
10
7.33E-02
7.02E-02
7.03E-02
6.95E-02
7.05E-02
7.07E-02
6.88E-02
6.91E-02
6.83E-02
7.02E-02
6.86E-02
20
7.23E-02
6.96E-02
6.99E-02
6.93E-02
6.96E-02
7.03E-02
6.85E-02
6.87E-02
6.79E-02
6.97E-02
6.88E-02
30
7.33E-02
7.02E-02
7.03E-02
6.95E-02
7.05E-02
7.07E-02
6.88E-02
6.91E-02
6.83E-02
7.02E-02
6.86E-02
50
9.13E-02
8.23E-02
8.67E-02
9.38E-02
9.26E-02
7.13E-02
6.92E-02
6.95E-02
6.89E-02
7.05E-02
6.88E-02
60
9.03E-02
8.19E-02
8.61E-02
9.24E-02
9.13E-02
7.12E-02
6.92E-02
6.98E-02
6.90E-02
7.07E-02
6.88E-02
70
7.19E-02
6.92E-02
6.96E-02
6.88E-02
6.96E-02
7.05E-02
6.86E-02
6.90E-02
6.85E-02
7.01E-02
6.86E-02
6.82E-02
1.02E-03
7.10E-02
6.54E-02
7.08E-02
1.45E-03
7.47E-02
6.68E-02
7.01E-02
1.20E-03
7.34E-02
6.69E-02
7.08E-02
1.45E-03
7.47E-02
6.68E-02
8.93E-02
4.76E-03
1.02E-01
7.63E-02
8.84E-02
4.36E-03
1.00E-01
7.64E-02
6.98E-02
1.21E-03
7.31E-02
6.65E-02
6.83E-02
9.40E-04
7.09E-02
6.57E-02
1.50E-01
PASS
6.94E-02
9.78E-04
7.21E-02
6.67E-02
1.50E-01
PASS
6.90E-02
9.68E-04
7.17E-02
6.64E-02
1.50E-01
PASS
6.94E-02
9.78E-04
7.21E-02
6.67E-02
1.50E-01
PASS
6.99E-02
9.89E-04
7.26E-02
6.72E-02
1.50E-01
PASS
7.00E-02
9.25E-04
7.25E-02
6.74E-02
1.50E-01
PASS
6.94E-02
9.00E-04
7.18E-02
6.69E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
318
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.156. Plot of Output Voltage Swing High IL= 1mA @ 3V #2 (V) versus total dose. The data show a
significant change with radiation, however it is not sufficient for any of the units-under-test to exceed
specification (including after application of the KTL statistics). The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
319
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.156. Raw data for Output Voltage Swing High IL= 1mA @ 3V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.79E-02
6.92E-02
6.51E-02
6.92E-02
6.60E-02
6.76E-02
6.83E-02
6.59E-02
6.69E-02
6.83E-02
6.77E-02
10
7.14E-02
7.17E-02
6.78E-02
7.21E-02
6.87E-02
6.86E-02
6.94E-02
6.66E-02
6.80E-02
6.92E-02
6.77E-02
20
7.07E-02
7.10E-02
6.71E-02
7.14E-02
6.82E-02
6.82E-02
6.92E-02
6.66E-02
6.75E-02
6.88E-02
6.77E-02
30
7.14E-02
7.17E-02
6.78E-02
7.21E-02
6.87E-02
6.86E-02
6.94E-02
6.66E-02
6.80E-02
6.92E-02
6.77E-02
50
1.03E-01
9.12E-02
9.13E-02
1.22E-01
9.49E-02
6.92E-02
6.97E-02
6.72E-02
6.84E-02
6.99E-02
6.77E-02
60
1.01E-01
9.04E-02
8.96E-02
1.17E-01
9.32E-02
6.93E-02
7.01E-02
6.75E-02
6.86E-02
7.01E-02
6.78E-02
70
7.03E-02
7.11E-02
6.69E-02
7.10E-02
6.81E-02
6.87E-02
6.94E-02
6.68E-02
6.80E-02
6.93E-02
6.75E-02
6.75E-02
1.85E-03
7.25E-02
6.24E-02
7.03E-02
1.96E-03
7.57E-02
6.50E-02
6.97E-02
1.91E-03
7.49E-02
6.44E-02
7.03E-02
1.96E-03
7.57E-02
6.50E-02
1.00E-01
1.30E-02
1.36E-01
6.47E-02
9.82E-02
1.15E-02
1.30E-01
6.68E-02
6.95E-02
1.88E-03
7.46E-02
6.43E-02
6.74E-02
1.01E-03
7.02E-02
6.46E-02
1.50E-01
PASS
6.83E-02
1.10E-03
7.14E-02
6.53E-02
1.50E-01
PASS
6.81E-02
1.05E-03
7.09E-02
6.52E-02
1.50E-01
PASS
6.83E-02
1.10E-03
7.14E-02
6.53E-02
1.50E-01
PASS
6.89E-02
1.14E-03
7.20E-02
6.58E-02
1.50E-01
PASS
6.91E-02
1.12E-03
7.22E-02
6.60E-02
1.50E-01
PASS
6.84E-02
1.06E-03
7.13E-02
6.55E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
320
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.157. Plot of Output Voltage Swing High IL= 1mA @ 3V #3 (V) versus total dose. The data show a
significant change with radiation, however it is not sufficient for any of the units-under-test to exceed
specification (including after application of the KTL statistics). The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
321
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.157. Raw data for Output Voltage Swing High IL= 1mA @ 3V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.76E-02
6.92E-02
6.52E-02
6.89E-02
6.67E-02
6.77E-02
6.78E-02
6.57E-02
6.72E-02
6.83E-02
6.77E-02
10
7.15E-02
7.23E-02
6.74E-02
7.19E-02
6.98E-02
6.88E-02
6.89E-02
6.67E-02
6.83E-02
6.95E-02
6.77E-02
20
7.06E-02
7.15E-02
6.69E-02
7.16E-02
6.88E-02
6.84E-02
6.84E-02
6.66E-02
6.80E-02
6.90E-02
6.77E-02
30
7.15E-02
7.23E-02
6.74E-02
7.19E-02
6.98E-02
6.88E-02
6.89E-02
6.67E-02
6.83E-02
6.95E-02
6.77E-02
50
1.03E-01
9.06E-02
8.72E-02
1.21E-01
1.07E-01
6.93E-02
6.92E-02
6.74E-02
6.88E-02
7.03E-02
6.79E-02
60
1.01E-01
8.97E-02
8.59E-02
1.16E-01
1.04E-01
6.93E-02
6.94E-02
6.76E-02
6.89E-02
7.02E-02
6.79E-02
70
7.04E-02
7.11E-02
6.68E-02
7.10E-02
6.85E-02
6.88E-02
6.89E-02
6.69E-02
6.82E-02
6.94E-02
6.77E-02
6.75E-02
1.65E-03
7.21E-02
6.30E-02
7.06E-02
1.99E-03
7.60E-02
6.51E-02
6.99E-02
1.98E-03
7.53E-02
6.44E-02
7.06E-02
1.99E-03
7.60E-02
6.51E-02
1.02E-01
1.35E-02
1.39E-01
6.48E-02
9.94E-02
1.21E-02
1.32E-01
6.63E-02
6.95E-02
1.86E-03
7.47E-02
6.44E-02
6.74E-02
1.01E-03
7.01E-02
6.46E-02
1.50E-01
PASS
6.84E-02
1.06E-03
7.14E-02
6.55E-02
1.50E-01
PASS
6.81E-02
9.19E-04
7.06E-02
6.56E-02
1.50E-01
PASS
6.84E-02
1.06E-03
7.14E-02
6.55E-02
1.50E-01
PASS
6.90E-02
1.06E-03
7.19E-02
6.61E-02
1.50E-01
PASS
6.91E-02
9.69E-04
7.17E-02
6.64E-02
1.50E-01
PASS
6.84E-02
9.40E-04
7.10E-02
6.59E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
322
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.158. Plot of Output Voltage Swing High IL= 1mA @ 3V #4 (V) versus total dose. The data show a
significant change with radiation, however it is not sufficient for any of the units-under-test to exceed
specification (including after application of the KTL statistics). The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
323
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.158. Raw data for Output Voltage Swing High IL= 1mA @ 3V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.94E-02
6.73E-02
6.84E-02
6.74E-02
6.83E-02
6.93E-02
6.77E-02
6.84E-02
6.70E-02
6.90E-02
6.89E-02
10
7.26E-02
7.01E-02
7.09E-02
6.96E-02
7.06E-02
7.04E-02
6.87E-02
6.95E-02
6.80E-02
7.00E-02
6.89E-02
20
7.16E-02
6.92E-02
7.04E-02
6.93E-02
7.00E-02
7.02E-02
6.86E-02
6.89E-02
6.77E-02
6.98E-02
6.88E-02
30
7.26E-02
7.01E-02
7.09E-02
6.96E-02
7.06E-02
7.04E-02
6.87E-02
6.95E-02
6.80E-02
7.00E-02
6.89E-02
50
8.81E-02
8.93E-02
9.23E-02
8.78E-02
9.09E-02
7.12E-02
6.91E-02
7.00E-02
6.87E-02
7.05E-02
6.91E-02
60
8.75E-02
8.85E-02
9.09E-02
8.69E-02
8.98E-02
7.11E-02
6.94E-02
7.01E-02
6.89E-02
7.06E-02
6.90E-02
70
7.15E-02
6.90E-02
7.03E-02
6.87E-02
6.96E-02
7.07E-02
6.86E-02
6.95E-02
6.83E-02
7.00E-02
6.85E-02
6.81E-02
8.33E-04
7.04E-02
6.59E-02
7.08E-02
1.15E-03
7.39E-02
6.76E-02
7.01E-02
1.00E-03
7.28E-02
6.73E-02
7.08E-02
1.15E-03
7.39E-02
6.76E-02
8.97E-02
1.91E-03
9.49E-02
8.45E-02
8.87E-02
1.66E-03
9.33E-02
8.42E-02
6.98E-02
1.13E-03
7.29E-02
6.67E-02
6.83E-02
9.43E-04
7.09E-02
6.57E-02
1.50E-01
PASS
6.93E-02
9.88E-04
7.20E-02
6.66E-02
1.50E-01
PASS
6.90E-02
9.81E-04
7.17E-02
6.63E-02
1.50E-01
PASS
6.93E-02
9.88E-04
7.20E-02
6.66E-02
1.50E-01
PASS
6.99E-02
1.02E-03
7.27E-02
6.71E-02
1.50E-01
PASS
7.00E-02
8.67E-04
7.24E-02
6.77E-02
1.50E-01
PASS
6.94E-02
9.84E-04
7.21E-02
6.67E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
324
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.159. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) versus total dose. The data show
a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed
specification (including after application of the KTL statistics). The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
325
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.159. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.25E-01
1.23E-01
1.23E-01
1.22E-01
1.23E-01
1.25E-01
1.22E-01
1.24E-01
1.22E-01
1.25E-01
1.24E-01
10
1.29E-01
1.26E-01
1.26E-01
1.24E-01
1.26E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.24E-01
20
1.28E-01
1.25E-01
1.25E-01
1.24E-01
1.25E-01
1.26E-01
1.23E-01
1.25E-01
1.23E-01
1.25E-01
1.24E-01
30
1.29E-01
1.26E-01
1.26E-01
1.24E-01
1.26E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.24E-01
50
1.56E-01
1.44E-01
1.51E-01
1.61E-01
1.59E-01
1.27E-01
1.25E-01
1.25E-01
1.24E-01
1.27E-01
1.24E-01
60
1.55E-01
1.43E-01
1.49E-01
1.59E-01
1.58E-01
1.27E-01
1.25E-01
1.26E-01
1.24E-01
1.27E-01
1.24E-01
70
1.28E-01
1.25E-01
1.26E-01
1.23E-01
1.24E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.24E-01
1.23E-01
1.24E-03
1.26E-01
1.20E-01
1.26E-01
1.82E-03
1.31E-01
1.21E-01
1.25E-01
1.51E-03
1.30E-01
1.21E-01
1.26E-01
1.82E-03
1.31E-01
1.21E-01
1.54E-01
7.16E-03
1.74E-01
1.35E-01
1.53E-01
6.58E-03
1.71E-01
1.35E-01
1.25E-01
1.63E-03
1.30E-01
1.21E-01
1.24E-01
1.50E-03
1.28E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.47E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.24E-01
1.43E-03
1.28E-01
1.21E-01
2.50E-01
PASS
1.25E-01
1.47E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.25E-01
1.38E-03
1.29E-01
1.22E-01
2.50E-01
PASS
1.26E-01
1.50E-03
1.30E-01
1.22E-01
2.50E-01
PASS
1.25E-01
1.38E-03
1.29E-01
1.21E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
326
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
8.00E-01
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.160. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) versus total dose. The data show
a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
327
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.160. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.22E-01
1.24E-01
1.20E-01
1.25E-01
1.20E-01
1.23E-01
1.23E-01
1.20E-01
1.21E-01
1.24E-01
1.23E-01
10
1.27E-01
1.28E-01
1.23E-01
1.28E-01
1.24E-01
1.24E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
20
1.25E-01
1.27E-01
1.22E-01
1.27E-01
1.23E-01
1.23E-01
1.24E-01
1.21E-01
1.23E-01
1.24E-01
1.23E-01
30
1.27E-01
1.28E-01
1.23E-01
1.28E-01
1.24E-01
1.24E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
50
1.78E-01
1.57E-01
1.58E-01
5.20E-01
1.64E-01
1.24E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.23E-01
60
1.74E-01
1.55E-01
1.55E-01
2.33E-01
1.61E-01
1.25E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.23E-01
70
1.25E-01
1.27E-01
1.21E-01
1.27E-01
1.22E-01
1.23E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
1.22E-01
2.31E-03
1.29E-01
1.16E-01
1.26E-01
2.46E-03
1.33E-01
1.19E-01
1.25E-01
2.44E-03
1.32E-01
1.18E-01
1.26E-01
2.46E-03
1.33E-01
1.19E-01
2.35E-01
1.59E-01
6.72E-01
-2.01E-01
1.76E-01
3.30E-02
2.66E-01
8.52E-02
1.24E-01
2.44E-03
1.31E-01
1.18E-01
1.22E-01
1.62E-03
1.27E-01
1.18E-01
2.50E-01
PASS
1.23E-01
1.46E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.23E-01
1.50E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.23E-01
1.46E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.24E-01
1.61E-03
1.28E-01
1.20E-01
2.50E-01
FAIL
1.24E-01
1.47E-03
1.28E-01
1.20E-01
2.50E-01
FAIL
1.23E-01
1.30E-03
1.27E-01
1.20E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
328
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
4.50E-01
4.00E-01
3.50E-01
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.161. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) versus total dose. The data show
a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
329
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.161. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.22E-01
1.25E-01
1.19E-01
1.24E-01
1.21E-01
1.22E-01
1.23E-01
1.20E-01
1.22E-01
1.24E-01
1.23E-01
10
1.27E-01
1.29E-01
1.22E-01
1.28E-01
1.25E-01
1.24E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
20
1.26E-01
1.27E-01
1.21E-01
1.27E-01
1.23E-01
1.23E-01
1.23E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
30
1.27E-01
1.29E-01
1.22E-01
1.28E-01
1.25E-01
1.24E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
50
1.79E-01
1.56E-01
1.51E-01
3.16E-01
1.94E-01
1.25E-01
1.24E-01
1.22E-01
1.24E-01
1.26E-01
1.23E-01
60
1.74E-01
1.54E-01
1.49E-01
2.26E-01
1.83E-01
1.25E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.23E-01
70
1.25E-01
1.27E-01
1.21E-01
1.26E-01
1.23E-01
1.24E-01
1.24E-01
1.21E-01
1.24E-01
1.25E-01
1.23E-01
1.22E-01
2.55E-03
1.29E-01
1.15E-01
1.26E-01
2.53E-03
1.33E-01
1.19E-01
1.25E-01
2.57E-03
1.32E-01
1.18E-01
1.26E-01
2.53E-03
1.33E-01
1.19E-01
1.99E-01
6.76E-02
3.84E-01
1.35E-02
1.77E-01
3.03E-02
2.60E-01
9.40E-02
1.25E-01
2.48E-03
1.31E-01
1.18E-01
1.22E-01
1.50E-03
1.26E-01
1.18E-01
2.50E-01
PASS
1.23E-01
1.53E-03
1.28E-01
1.19E-01
2.50E-01
PASS
1.23E-01
1.53E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.23E-01
1.53E-03
1.28E-01
1.19E-01
2.50E-01
PASS
1.24E-01
1.61E-03
1.28E-01
1.20E-01
2.50E-01
FAIL
1.25E-01
1.38E-03
1.28E-01
1.21E-01
2.50E-01
FAIL
1.23E-01
1.55E-03
1.28E-01
1.19E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
330
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.162. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) versus total dose. The data show
a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed
specification (including after application of the KTL statistics). The solid diamonds are the average of the
measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average
of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under
electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of
the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2000 Certified Company
331
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.162. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.25E-01
1.22E-01
1.24E-01
1.22E-01
1.23E-01
1.25E-01
1.22E-01
1.24E-01
1.22E-01
1.25E-01
1.24E-01
10
1.29E-01
1.26E-01
1.27E-01
1.24E-01
1.26E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.24E-01
20
1.27E-01
1.25E-01
1.27E-01
1.24E-01
1.25E-01
1.26E-01
1.23E-01
1.25E-01
1.22E-01
1.26E-01
1.24E-01
30
1.29E-01
1.26E-01
1.27E-01
1.24E-01
1.26E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.24E-01
50
1.51E-01
1.54E-01
1.59E-01
1.51E-01
1.56E-01
1.27E-01
1.24E-01
1.26E-01
1.24E-01
1.27E-01
1.24E-01
60
1.50E-01
1.53E-01
1.57E-01
1.50E-01
1.54E-01
1.27E-01
1.25E-01
1.27E-01
1.24E-01
1.27E-01
1.24E-01
70
1.27E-01
1.24E-01
1.26E-01
1.24E-01
1.25E-01
1.26E-01
1.24E-01
1.26E-01
1.23E-01
1.26E-01
1.24E-01
1.23E-01
1.30E-03
1.27E-01
1.20E-01
1.26E-01
1.64E-03
1.31E-01
1.22E-01
1.26E-01
1.37E-03
1.29E-01
1.22E-01
1.26E-01
1.64E-03
1.31E-01
1.22E-01
1.54E-01
3.27E-03
1.63E-01
1.45E-01
1.53E-01
3.07E-03
1.61E-01
1.45E-01
1.25E-01
1.37E-03
1.29E-01
1.21E-01
1.23E-01
1.47E-03
1.28E-01
1.19E-01
2.50E-01
PASS
1.25E-01
1.44E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.24E-01
1.59E-03
1.29E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.44E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.26E-01
1.23E-03
1.29E-01
1.22E-01
2.50E-01
PASS
1.26E-01
1.46E-03
1.30E-01
1.22E-01
2.50E-01
PASS
1.25E-01
1.63E-03
1.29E-01
1.20E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
332
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.163. Plot of Output Voltage Swing Low IL= 0mA @ 3V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
333
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.163. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.49E-02
1.47E-02
1.45E-02
1.49E-02
1.45E-02
1.46E-02
1.45E-02
1.44E-02
1.47E-02
1.46E-02
1.47E-02
10
1.44E-02
1.44E-02
1.42E-02
1.45E-02
1.43E-02
1.52E-02
1.49E-02
1.48E-02
1.49E-02
1.50E-02
1.46E-02
20
1.46E-02
1.46E-02
1.44E-02
1.47E-02
1.46E-02
1.51E-02
1.48E-02
1.47E-02
1.47E-02
1.50E-02
1.45E-02
30
1.44E-02
1.44E-02
1.42E-02
1.45E-02
1.43E-02
1.52E-02
1.49E-02
1.48E-02
1.49E-02
1.50E-02
1.46E-02
50
1.01E-02
1.02E-02
1.01E-02
9.79E-03
1.00E-02
1.52E-02
1.54E-02
1.49E-02
1.53E-02
1.51E-02
1.45E-02
60
1.03E-02
1.05E-02
1.00E-02
9.98E-03
9.99E-03
1.53E-02
1.52E-02
1.51E-02
1.53E-02
1.52E-02
1.46E-02
70
1.51E-02
1.51E-02
1.47E-02
1.53E-02
1.52E-02
1.51E-02
1.50E-02
1.48E-02
1.49E-02
1.51E-02
1.46E-02
1.47E-02
1.88E-04
1.52E-02
1.42E-02
1.44E-02
1.15E-04
1.47E-02
1.41E-02
1.46E-02
1.06E-04
1.49E-02
1.43E-02
1.44E-02
1.15E-04
1.47E-02
1.41E-02
1.00E-02
1.62E-04
1.05E-02
9.60E-03
1.01E-02
2.05E-04
1.07E-02
9.58E-03
1.51E-02
1.97E-04
1.56E-02
1.45E-02
1.45E-02
1.09E-04
1.48E-02
1.42E-02
3.00E-02
PASS
1.50E-02
1.61E-04
1.54E-02
1.45E-02
6.00E-02
PASS
1.48E-02
1.63E-04
1.53E-02
1.44E-02
6.00E-02
PASS
1.50E-02
1.61E-04
1.54E-02
1.45E-02
6.00E-02
PASS
1.52E-02
1.74E-04
1.57E-02
1.47E-02
6.00E-02
PASS
1.52E-02
6.73E-05
1.54E-02
1.50E-02
6.00E-02
PASS
1.50E-02
1.28E-04
1.53E-02
1.46E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
334
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.164. Plot of Output Voltage Swing Low IL= 0mA @ 3V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
335
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.164. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.50E-02
1.51E-02
1.50E-02
1.49E-02
1.51E-02
1.47E-02
1.52E-02
1.49E-02
1.47E-02
1.45E-02
1.49E-02
10
1.47E-02
1.41E-02
1.36E-02
1.41E-02
1.47E-02
1.51E-02
1.55E-02
1.53E-02
1.54E-02
1.49E-02
1.46E-02
20
1.48E-02
1.51E-02
1.48E-02
1.47E-02
1.49E-02
1.49E-02
1.55E-02
1.50E-02
1.50E-02
1.47E-02
1.46E-02
30
1.47E-02
1.41E-02
1.36E-02
1.41E-02
1.47E-02
1.51E-02
1.55E-02
1.53E-02
1.54E-02
1.49E-02
1.46E-02
50
9.87E-03
1.03E-02
1.01E-02
9.99E-03
9.94E-03
1.52E-02
1.58E-02
1.54E-02
1.54E-02
1.50E-02
1.48E-02
60
9.93E-03
1.04E-02
1.02E-02
9.84E-03
1.03E-02
1.53E-02
1.58E-02
1.56E-02
1.55E-02
1.50E-02
1.49E-02
70
1.54E-02
1.55E-02
1.53E-02
1.53E-02
1.55E-02
1.50E-02
1.55E-02
1.53E-02
1.52E-02
1.48E-02
1.46E-02
1.50E-02
6.23E-05
1.52E-02
1.48E-02
1.42E-02
4.69E-04
1.55E-02
1.30E-02
1.49E-02
1.29E-04
1.52E-02
1.45E-02
1.42E-02
4.69E-04
1.55E-02
1.30E-02
1.00E-02
1.77E-04
1.05E-02
9.55E-03
1.01E-02
2.19E-04
1.07E-02
9.51E-03
1.54E-02
8.34E-05
1.56E-02
1.52E-02
1.48E-02
2.63E-04
1.55E-02
1.41E-02
3.00E-02
PASS
1.52E-02
2.27E-04
1.59E-02
1.46E-02
6.00E-02
PASS
1.50E-02
2.92E-04
1.58E-02
1.42E-02
6.00E-02
PASS
1.52E-02
2.27E-04
1.59E-02
1.46E-02
6.00E-02
PASS
1.54E-02
2.97E-04
1.62E-02
1.46E-02
6.00E-02
PASS
1.54E-02
2.93E-04
1.63E-02
1.46E-02
6.00E-02
PASS
1.52E-02
2.59E-04
1.59E-02
1.44E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
336
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.165. Plot of Output Voltage Swing Low IL= 0mA @ 3V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
337
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.165. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.46E-02
1.47E-02
1.47E-02
1.47E-02
1.47E-02
1.46E-02
1.47E-02
1.47E-02
1.46E-02
1.44E-02
1.43E-02
10
1.43E-02
1.37E-02
1.40E-02
1.39E-02
1.32E-02
1.48E-02
1.53E-02
1.52E-02
1.52E-02
1.48E-02
1.43E-02
20
1.44E-02
1.46E-02
1.45E-02
1.46E-02
1.45E-02
1.47E-02
1.52E-02
1.49E-02
1.50E-02
1.47E-02
1.41E-02
30
1.43E-02
1.37E-02
1.40E-02
1.39E-02
1.32E-02
1.48E-02
1.53E-02
1.52E-02
1.52E-02
1.48E-02
1.43E-02
50
9.42E-03
1.01E-02
9.98E-03
9.79E-03
9.69E-03
1.50E-02
1.54E-02
1.55E-02
1.54E-02
1.50E-02
1.43E-02
60
9.67E-03
1.03E-02
9.91E-03
9.98E-03
9.79E-03
1.51E-02
1.55E-02
1.56E-02
1.56E-02
1.50E-02
1.43E-02
70
1.50E-02
1.51E-02
1.51E-02
1.51E-02
1.53E-02
1.46E-02
1.52E-02
1.50E-02
1.51E-02
1.48E-02
1.43E-02
1.47E-02
3.03E-05
1.47E-02
1.46E-02
1.38E-02
4.21E-04
1.50E-02
1.27E-02
1.45E-02
5.94E-05
1.47E-02
1.44E-02
1.38E-02
4.21E-04
1.50E-02
1.27E-02
9.80E-03
2.73E-04
1.06E-02
9.05E-03
9.94E-03
2.50E-04
1.06E-02
9.25E-03
1.51E-02
9.45E-05
1.54E-02
1.49E-02
1.46E-02
1.51E-04
1.50E-02
1.42E-02
3.00E-02
PASS
1.51E-02
2.51E-04
1.57E-02
1.44E-02
6.00E-02
PASS
1.49E-02
1.92E-04
1.54E-02
1.44E-02
6.00E-02
PASS
1.51E-02
2.51E-04
1.57E-02
1.44E-02
6.00E-02
PASS
1.53E-02
2.54E-04
1.59E-02
1.46E-02
6.00E-02
PASS
1.53E-02
2.89E-04
1.61E-02
1.46E-02
6.00E-02
PASS
1.49E-02
2.32E-04
1.56E-02
1.43E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
338
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.166. Plot of Output Voltage Swing Low IL= 0mA @ 3V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
339
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.166. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.49E-02
1.48E-02
1.48E-02
1.53E-02
1.50E-02
1.49E-02
1.48E-02
1.47E-02
1.49E-02
1.48E-02
1.50E-02
10
1.48E-02
1.38E-02
1.39E-02
1.51E-02
1.45E-02
1.53E-02
1.51E-02
1.52E-02
1.54E-02
1.54E-02
1.48E-02
20
1.47E-02
1.47E-02
1.46E-02
1.52E-02
1.49E-02
1.52E-02
1.51E-02
1.50E-02
1.51E-02
1.51E-02
1.49E-02
30
1.48E-02
1.38E-02
1.39E-02
1.51E-02
1.45E-02
1.53E-02
1.51E-02
1.52E-02
1.54E-02
1.54E-02
1.48E-02
50
1.06E-02
1.03E-02
1.00E-02
1.01E-02
1.04E-02
1.55E-02
1.53E-02
1.54E-02
1.54E-02
1.54E-02
1.48E-02
60
1.06E-02
1.05E-02
1.03E-02
1.03E-02
1.03E-02
1.55E-02
1.54E-02
1.53E-02
1.57E-02
1.55E-02
1.49E-02
70
1.52E-02
1.50E-02
1.53E-02
1.55E-02
1.53E-02
1.53E-02
1.53E-02
1.50E-02
1.53E-02
1.53E-02
1.48E-02
1.50E-02
1.91E-04
1.55E-02
1.44E-02
1.44E-02
5.69E-04
1.60E-02
1.29E-02
1.48E-02
2.09E-04
1.54E-02
1.43E-02
1.44E-02
5.69E-04
1.60E-02
1.29E-02
1.03E-02
2.14E-04
1.09E-02
9.70E-03
1.04E-02
1.40E-04
1.07E-02
9.98E-03
1.53E-02
1.90E-04
1.58E-02
1.47E-02
1.48E-02
9.34E-05
1.51E-02
1.46E-02
3.00E-02
PASS
1.53E-02
1.15E-04
1.56E-02
1.49E-02
6.00E-02
PASS
1.51E-02
5.94E-05
1.52E-02
1.49E-02
6.00E-02
PASS
1.53E-02
1.15E-04
1.56E-02
1.49E-02
6.00E-02
PASS
1.54E-02
6.44E-05
1.56E-02
1.52E-02
6.00E-02
PASS
1.55E-02
1.29E-04
1.58E-02
1.51E-02
6.00E-02
PASS
1.52E-02
1.15E-04
1.55E-02
1.49E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
340
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.167. Plot of Output Voltage Swing Low IL= 1mA @ 3V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
341
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.167. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.01E-02
4.03E-02
4.02E-02
4.02E-02
4.01E-02
4.01E-02
3.99E-02
3.98E-02
4.03E-02
4.04E-02
3.97E-02
10
4.06E-02
4.06E-02
4.05E-02
4.05E-02
4.02E-02
4.05E-02
4.03E-02
4.03E-02
4.07E-02
4.07E-02
3.98E-02
20
4.04E-02
4.05E-02
4.04E-02
4.06E-02
4.05E-02
4.05E-02
4.01E-02
4.03E-02
4.06E-02
4.06E-02
3.96E-02
30
4.06E-02
4.06E-02
4.05E-02
4.05E-02
4.02E-02
4.05E-02
4.03E-02
4.03E-02
4.07E-02
4.07E-02
3.98E-02
50
3.78E-02
3.79E-02
3.78E-02
3.74E-02
3.75E-02
4.07E-02
4.05E-02
4.05E-02
4.12E-02
4.10E-02
3.98E-02
60
3.80E-02
3.80E-02
3.80E-02
3.76E-02
3.77E-02
4.10E-02
4.08E-02
4.06E-02
4.11E-02
4.11E-02
3.97E-02
70
4.09E-02
4.09E-02
4.09E-02
4.09E-02
4.06E-02
4.06E-02
4.03E-02
4.04E-02
4.08E-02
4.07E-02
3.97E-02
4.02E-02
8.53E-05
4.04E-02
3.99E-02
4.05E-02
1.49E-04
4.09E-02
4.01E-02
4.05E-02
7.23E-05
4.07E-02
4.03E-02
4.05E-02
1.49E-04
4.09E-02
4.01E-02
3.77E-02
2.07E-04
3.82E-02
3.71E-02
3.79E-02
2.05E-04
3.84E-02
3.73E-02
4.08E-02
1.13E-04
4.11E-02
4.05E-02
4.01E-02
2.36E-04
4.07E-02
3.95E-02
1.00E-01
PASS
4.05E-02
1.81E-04
4.10E-02
4.00E-02
1.00E-01
PASS
4.04E-02
1.99E-04
4.09E-02
3.99E-02
1.00E-01
PASS
4.05E-02
1.81E-04
4.10E-02
4.00E-02
1.00E-01
PASS
4.08E-02
2.96E-04
4.16E-02
4.00E-02
1.00E-01
PASS
4.09E-02
2.26E-04
4.16E-02
4.03E-02
1.00E-01
PASS
4.06E-02
1.94E-04
4.11E-02
4.00E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
342
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.168. Plot of Output Voltage Swing Low IL= 1mA @ 3V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
343
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.168. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.08E-02
4.06E-02
4.01E-02
4.09E-02
4.05E-02
4.05E-02
4.06E-02
4.01E-02
4.04E-02
3.99E-02
4.04E-02
10
4.13E-02
4.04E-02
3.94E-02
4.08E-02
4.09E-02
4.07E-02
4.10E-02
4.03E-02
4.07E-02
4.04E-02
4.05E-02
20
4.12E-02
4.09E-02
4.01E-02
4.11E-02
4.08E-02
4.06E-02
4.09E-02
4.02E-02
4.06E-02
4.02E-02
4.04E-02
30
4.13E-02
4.04E-02
3.94E-02
4.08E-02
4.09E-02
4.07E-02
4.10E-02
4.03E-02
4.07E-02
4.04E-02
4.05E-02
50
3.81E-02
3.80E-02
3.74E-02
3.80E-02
3.78E-02
4.10E-02
4.13E-02
4.07E-02
4.12E-02
4.07E-02
4.06E-02
60
3.82E-02
3.82E-02
3.77E-02
3.83E-02
3.80E-02
4.10E-02
4.15E-02
4.07E-02
4.12E-02
4.07E-02
4.06E-02
70
4.16E-02
4.13E-02
4.07E-02
4.16E-02
4.12E-02
4.08E-02
4.10E-02
4.04E-02
4.07E-02
4.06E-02
4.04E-02
4.06E-02
3.09E-04
4.14E-02
3.97E-02
4.05E-02
7.04E-04
4.25E-02
3.86E-02
4.08E-02
4.16E-04
4.20E-02
3.97E-02
4.05E-02
7.04E-04
4.25E-02
3.86E-02
3.79E-02
2.90E-04
3.86E-02
3.71E-02
3.81E-02
2.49E-04
3.88E-02
3.74E-02
4.13E-02
3.96E-04
4.24E-02
4.02E-02
4.03E-02
2.68E-04
4.10E-02
3.96E-02
1.00E-01
PASS
4.06E-02
2.71E-04
4.14E-02
3.99E-02
1.00E-01
PASS
4.05E-02
3.04E-04
4.14E-02
3.97E-02
1.00E-01
PASS
4.06E-02
2.71E-04
4.14E-02
3.99E-02
1.00E-01
PASS
4.10E-02
2.95E-04
4.18E-02
4.02E-02
1.00E-01
PASS
4.10E-02
3.33E-04
4.19E-02
4.01E-02
1.00E-01
PASS
4.07E-02
2.08E-04
4.13E-02
4.01E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
344
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.169. Plot of Output Voltage Swing Low IL= 1mA @ 3V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
345
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.169. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.06E-02
4.00E-02
3.97E-02
4.03E-02
4.01E-02
4.01E-02
4.01E-02
3.98E-02
4.03E-02
3.98E-02
3.98E-02
10
4.08E-02
3.98E-02
3.97E-02
4.05E-02
3.94E-02
4.03E-02
4.07E-02
4.01E-02
4.06E-02
4.02E-02
3.98E-02
20
4.06E-02
4.04E-02
3.99E-02
4.07E-02
4.03E-02
4.02E-02
4.04E-02
4.01E-02
4.05E-02
4.01E-02
3.96E-02
30
4.08E-02
3.98E-02
3.97E-02
4.05E-02
3.94E-02
4.03E-02
4.07E-02
4.01E-02
4.06E-02
4.02E-02
3.98E-02
50
3.76E-02
3.77E-02
3.70E-02
3.76E-02
3.74E-02
4.05E-02
4.09E-02
4.05E-02
4.11E-02
4.04E-02
3.98E-02
60
3.77E-02
3.78E-02
3.73E-02
3.76E-02
3.75E-02
4.06E-02
4.12E-02
4.05E-02
4.11E-02
4.07E-02
3.99E-02
70
4.13E-02
4.07E-02
4.03E-02
4.13E-02
4.09E-02
4.03E-02
4.07E-02
4.02E-02
4.07E-02
4.02E-02
3.98E-02
4.01E-02
3.13E-04
4.10E-02
3.93E-02
4.00E-02
5.65E-04
4.16E-02
3.85E-02
4.04E-02
3.04E-04
4.12E-02
3.95E-02
4.00E-02
5.65E-04
4.16E-02
3.85E-02
3.75E-02
2.62E-04
3.82E-02
3.67E-02
3.76E-02
2.19E-04
3.82E-02
3.70E-02
4.09E-02
4.57E-04
4.22E-02
3.97E-02
4.00E-02
2.13E-04
4.06E-02
3.94E-02
1.00E-01
PASS
4.04E-02
2.21E-04
4.10E-02
3.98E-02
1.00E-01
PASS
4.02E-02
1.85E-04
4.07E-02
3.97E-02
1.00E-01
PASS
4.04E-02
2.21E-04
4.10E-02
3.98E-02
1.00E-01
PASS
4.07E-02
2.67E-04
4.14E-02
4.00E-02
1.00E-01
PASS
4.08E-02
2.96E-04
4.16E-02
4.00E-02
1.00E-01
PASS
4.04E-02
2.54E-04
4.11E-02
3.97E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
346
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.170. Plot of Output Voltage Swing Low IL= 1mA @ 3V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
347
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.170. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.06E-02
4.06E-02
4.07E-02
4.08E-02
4.05E-02
4.05E-02
4.02E-02
4.03E-02
4.07E-02
4.07E-02
4.02E-02
10
4.11E-02
4.02E-02
4.05E-02
4.10E-02
4.06E-02
4.09E-02
4.07E-02
4.05E-02
4.12E-02
4.10E-02
4.01E-02
20
4.08E-02
4.08E-02
4.09E-02
4.11E-02
4.08E-02
4.09E-02
4.03E-02
4.05E-02
4.11E-02
4.08E-02
4.01E-02
30
4.11E-02
4.02E-02
4.05E-02
4.10E-02
4.06E-02
4.09E-02
4.07E-02
4.05E-02
4.12E-02
4.10E-02
4.01E-02
50
3.84E-02
3.80E-02
3.80E-02
3.80E-02
3.77E-02
4.13E-02
4.08E-02
4.09E-02
4.14E-02
4.13E-02
4.01E-02
60
3.84E-02
3.81E-02
3.81E-02
3.80E-02
3.78E-02
4.14E-02
4.09E-02
4.11E-02
4.17E-02
4.14E-02
4.03E-02
70
4.14E-02
4.11E-02
4.14E-02
4.14E-02
4.10E-02
4.09E-02
4.06E-02
4.07E-02
4.11E-02
4.11E-02
4.03E-02
4.06E-02
1.27E-04
4.10E-02
4.03E-02
4.07E-02
3.88E-04
4.17E-02
3.96E-02
4.09E-02
1.34E-04
4.12E-02
4.05E-02
4.07E-02
3.88E-04
4.17E-02
3.96E-02
3.80E-02
2.44E-04
3.87E-02
3.73E-02
3.81E-02
1.86E-04
3.86E-02
3.76E-02
4.13E-02
1.97E-04
4.18E-02
4.07E-02
4.05E-02
2.39E-04
4.11E-02
3.98E-02
1.00E-01
PASS
4.09E-02
2.82E-04
4.16E-02
4.01E-02
1.00E-01
PASS
4.07E-02
3.10E-04
4.16E-02
3.99E-02
1.00E-01
PASS
4.09E-02
2.82E-04
4.16E-02
4.01E-02
1.00E-01
PASS
4.11E-02
2.82E-04
4.19E-02
4.04E-02
1.00E-01
PASS
4.13E-02
3.22E-04
4.22E-02
4.04E-02
1.00E-01
PASS
4.09E-02
2.09E-04
4.15E-02
4.03E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
348
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.171. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
349
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.171. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.80E-02
7.84E-02
7.82E-02
7.72E-02
7.73E-02
7.77E-02
7.71E-02
7.76E-02
7.75E-02
7.84E-02
7.67E-02
10
7.84E-02
7.90E-02
7.86E-02
7.79E-02
7.76E-02
7.80E-02
7.77E-02
7.82E-02
7.81E-02
7.87E-02
7.67E-02
20
7.80E-02
7.85E-02
7.86E-02
7.75E-02
7.78E-02
7.77E-02
7.75E-02
7.79E-02
7.80E-02
7.85E-02
7.63E-02
30
7.84E-02
7.90E-02
7.86E-02
7.79E-02
7.76E-02
7.80E-02
7.77E-02
7.82E-02
7.81E-02
7.87E-02
7.67E-02
50
7.64E-02
7.70E-02
7.65E-02
7.53E-02
7.54E-02
7.85E-02
7.77E-02
7.86E-02
7.86E-02
7.90E-02
7.70E-02
60
7.67E-02
7.73E-02
7.68E-02
7.61E-02
7.62E-02
7.81E-02
7.81E-02
7.87E-02
7.86E-02
7.92E-02
7.69E-02
70
7.83E-02
7.87E-02
7.91E-02
7.83E-02
7.78E-02
7.78E-02
7.78E-02
7.85E-02
7.82E-02
7.87E-02
7.65E-02
7.78E-02
5.22E-04
7.92E-02
7.64E-02
7.83E-02
5.40E-04
7.98E-02
7.68E-02
7.81E-02
4.64E-04
7.93E-02
7.68E-02
7.83E-02
5.40E-04
7.98E-02
7.68E-02
7.61E-02
7.30E-04
7.81E-02
7.41E-02
7.66E-02
4.95E-04
7.80E-02
7.53E-02
7.84E-02
4.80E-04
7.97E-02
7.71E-02
7.76E-02
4.66E-04
7.89E-02
7.64E-02
2.00E-01
PASS
7.81E-02
3.34E-04
7.91E-02
7.72E-02
2.00E-01
PASS
7.79E-02
3.77E-04
7.89E-02
7.69E-02
2.00E-01
PASS
7.81E-02
3.34E-04
7.91E-02
7.72E-02
2.00E-01
PASS
7.85E-02
4.94E-04
7.99E-02
7.71E-02
2.00E-01
PASS
7.85E-02
4.74E-04
7.98E-02
7.72E-02
2.00E-01
PASS
7.82E-02
4.03E-04
7.93E-02
7.71E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
350
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.172. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
351
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.172. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.87E-02
7.83E-02
7.72E-02
7.86E-02
7.77E-02
7.88E-02
7.80E-02
7.73E-02
7.78E-02
7.81E-02
7.83E-02
10
7.92E-02
7.85E-02
7.70E-02
7.87E-02
7.82E-02
7.86E-02
7.85E-02
7.77E-02
7.85E-02
7.79E-02
7.80E-02
20
7.87E-02
7.89E-02
7.77E-02
7.92E-02
7.84E-02
7.85E-02
7.81E-02
7.77E-02
7.83E-02
7.80E-02
7.82E-02
30
7.92E-02
7.85E-02
7.70E-02
7.87E-02
7.82E-02
7.86E-02
7.85E-02
7.77E-02
7.85E-02
7.79E-02
7.80E-02
50
7.69E-02
7.68E-02
7.60E-02
7.67E-02
7.68E-02
7.90E-02
7.88E-02
7.82E-02
7.84E-02
7.82E-02
7.82E-02
60
7.72E-02
7.73E-02
7.61E-02
7.73E-02
7.67E-02
7.91E-02
7.92E-02
7.80E-02
7.90E-02
7.86E-02
7.81E-02
70
7.93E-02
7.93E-02
7.81E-02
7.95E-02
7.87E-02
7.91E-02
7.84E-02
7.73E-02
7.83E-02
7.83E-02
7.80E-02
7.81E-02
6.38E-04
7.98E-02
7.63E-02
7.83E-02
8.28E-04
8.06E-02
7.60E-02
7.86E-02
5.77E-04
8.02E-02
7.70E-02
7.83E-02
8.28E-04
8.06E-02
7.60E-02
7.66E-02
3.57E-04
7.76E-02
7.56E-02
7.69E-02
5.23E-04
7.83E-02
7.55E-02
7.90E-02
5.67E-04
8.06E-02
7.74E-02
7.80E-02
5.18E-04
7.94E-02
7.66E-02
2.00E-01
PASS
7.83E-02
3.99E-04
7.94E-02
7.72E-02
2.00E-01
PASS
7.81E-02
3.07E-04
7.90E-02
7.73E-02
2.00E-01
PASS
7.83E-02
3.99E-04
7.94E-02
7.72E-02
2.00E-01
PASS
7.85E-02
3.47E-04
7.95E-02
7.76E-02
2.00E-01
PASS
7.88E-02
4.83E-04
8.01E-02
7.75E-02
2.00E-01
PASS
7.83E-02
6.25E-04
8.00E-02
7.66E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
352
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.173. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
353
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.173. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.77E-02
7.75E-02
7.66E-02
7.79E-02
7.74E-02
7.79E-02
7.71E-02
7.68E-02
7.74E-02
7.75E-02
7.72E-02
10
7.86E-02
7.77E-02
7.69E-02
7.81E-02
7.70E-02
7.76E-02
7.77E-02
7.73E-02
7.79E-02
7.77E-02
7.72E-02
20
7.83E-02
7.79E-02
7.73E-02
7.82E-02
7.76E-02
7.77E-02
7.79E-02
7.72E-02
7.75E-02
7.74E-02
7.70E-02
30
7.86E-02
7.77E-02
7.69E-02
7.81E-02
7.70E-02
7.76E-02
7.77E-02
7.73E-02
7.79E-02
7.77E-02
7.72E-02
50
7.63E-02
7.63E-02
7.51E-02
7.62E-02
7.56E-02
7.82E-02
7.81E-02
7.77E-02
7.82E-02
7.80E-02
7.72E-02
60
7.65E-02
7.65E-02
7.54E-02
7.62E-02
7.59E-02
7.82E-02
7.81E-02
7.74E-02
7.85E-02
7.81E-02
7.72E-02
70
7.88E-02
7.85E-02
7.76E-02
7.88E-02
7.80E-02
7.80E-02
7.81E-02
7.74E-02
7.78E-02
7.77E-02
7.70E-02
7.74E-02
5.04E-04
7.88E-02
7.60E-02
7.77E-02
7.46E-04
7.97E-02
7.56E-02
7.79E-02
4.18E-04
7.90E-02
7.67E-02
7.77E-02
7.46E-04
7.97E-02
7.56E-02
7.59E-02
5.24E-04
7.73E-02
7.45E-02
7.61E-02
4.45E-04
7.73E-02
7.49E-02
7.83E-02
5.19E-04
7.98E-02
7.69E-02
7.73E-02
4.17E-04
7.84E-02
7.62E-02
2.00E-01
PASS
7.76E-02
2.52E-04
7.83E-02
7.70E-02
2.00E-01
PASS
7.75E-02
2.54E-04
7.82E-02
7.68E-02
2.00E-01
PASS
7.76E-02
2.52E-04
7.83E-02
7.70E-02
2.00E-01
PASS
7.80E-02
2.05E-04
7.86E-02
7.75E-02
2.00E-01
PASS
7.81E-02
3.94E-04
7.91E-02
7.70E-02
2.00E-01
PASS
7.78E-02
2.92E-04
7.86E-02
7.70E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
354
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.174. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
355
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.174. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.85E-02
7.84E-02
7.86E-02
7.85E-02
7.78E-02
7.83E-02
7.79E-02
7.84E-02
7.83E-02
7.89E-02
7.77E-02
10
7.91E-02
7.88E-02
7.88E-02
7.86E-02
7.83E-02
7.88E-02
7.83E-02
7.84E-02
7.88E-02
7.92E-02
7.76E-02
20
7.89E-02
7.87E-02
7.92E-02
7.86E-02
7.87E-02
7.85E-02
7.81E-02
7.83E-02
7.89E-02
7.89E-02
7.78E-02
30
7.91E-02
7.88E-02
7.88E-02
7.86E-02
7.83E-02
7.88E-02
7.83E-02
7.84E-02
7.88E-02
7.92E-02
7.76E-02
50
7.69E-02
7.71E-02
7.75E-02
7.67E-02
7.63E-02
7.91E-02
7.83E-02
7.90E-02
7.95E-02
7.98E-02
7.79E-02
60
7.76E-02
7.75E-02
7.77E-02
7.66E-02
7.65E-02
7.95E-02
7.87E-02
7.92E-02
7.97E-02
7.98E-02
7.78E-02
70
7.92E-02
7.94E-02
7.98E-02
7.89E-02
7.89E-02
7.86E-02
7.81E-02
7.86E-02
7.92E-02
7.93E-02
7.74E-02
7.83E-02
3.44E-04
7.93E-02
7.74E-02
7.87E-02
3.10E-04
7.96E-02
7.79E-02
7.88E-02
2.45E-04
7.95E-02
7.82E-02
7.87E-02
3.10E-04
7.96E-02
7.79E-02
7.69E-02
4.27E-04
7.81E-02
7.57E-02
7.72E-02
5.94E-04
7.88E-02
7.55E-02
7.92E-02
3.94E-04
8.03E-02
7.81E-02
7.84E-02
3.41E-04
7.93E-02
7.74E-02
2.00E-01
PASS
7.87E-02
3.64E-04
7.97E-02
7.77E-02
2.00E-01
PASS
7.85E-02
3.51E-04
7.95E-02
7.76E-02
2.00E-01
PASS
7.87E-02
3.64E-04
7.97E-02
7.77E-02
2.00E-01
PASS
7.91E-02
5.41E-04
8.06E-02
7.76E-02
2.00E-01
PASS
7.94E-02
4.41E-04
8.06E-02
7.82E-02
2.00E-01
PASS
7.88E-02
4.75E-04
8.01E-02
7.75E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
356
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 3V #1 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.175. Plot of Positive Short-Circuit Current @ 3V #1 (A) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
357
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.175. Raw data for Positive Short-Circuit Current @ 3V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 3V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.97E-02
-2.06E-02
-2.04E-02
-2.07E-02
-2.05E-02
-1.98E-02
-2.06E-02
-2.04E-02
-2.07E-02
-2.00E-02
-2.01E-02
10
-1.86E-02
-1.96E-02
-1.94E-02
-1.96E-02
-1.93E-02
-1.93E-02
-2.01E-02
-2.00E-02
-2.01E-02
-1.96E-02
-2.01E-02
20
-1.88E-02
-1.98E-02
-1.97E-02
-1.99E-02
-1.97E-02
-1.94E-02
-2.03E-02
-2.01E-02
-2.03E-02
-1.97E-02
-2.01E-02
30
-1.86E-02
-1.96E-02
-1.94E-02
-1.96E-02
-1.93E-02
-1.93E-02
-2.01E-02
-2.00E-02
-2.01E-02
-1.96E-02
-2.01E-02
50
-8.05E-03
-1.12E-02
-9.48E-03
-6.36E-03
-6.91E-03
-1.91E-02
-2.00E-02
-1.98E-02
-1.99E-02
-1.95E-02
-2.01E-02
60
-8.49E-03
-1.17E-02
-1.00E-02
-6.87E-03
-7.38E-03
-1.92E-02
-2.00E-02
-1.98E-02
-2.00E-02
-1.95E-02
-2.01E-02
70
-1.90E-02
-2.00E-02
-1.98E-02
-2.01E-02
-1.98E-02
-1.93E-02
-2.01E-02
-1.99E-02
-2.01E-02
-1.96E-02
-2.01E-02
-2.04E-02
4.07E-04
-1.93E-02
-2.15E-02
-1.93E-02
4.04E-04
-1.82E-02
-2.04E-02
-1.96E-02
4.48E-04
-1.83E-02
-2.08E-02
-1.93E-02
4.04E-04
-1.82E-02
-2.04E-02
-8.41E-03
1.98E-03
-2.97E-03
-1.38E-02
-8.88E-03
1.97E-03
-3.49E-03
-1.43E-02
-1.97E-02
4.36E-04
-1.85E-02
-2.09E-02
-2.03E-02
3.82E-04
-1.93E-02
-2.14E-02
-1.20E-02
PASS
-1.98E-02
3.55E-04
-1.89E-02
-2.08E-02
-8.00E-03
PASS
-1.99E-02
3.60E-04
-1.90E-02
-2.09E-02
-8.00E-03
PASS
-1.98E-02
3.55E-04
-1.89E-02
-2.08E-02
-8.00E-03
PASS
-1.97E-02
3.47E-04
-1.87E-02
-2.06E-02
-8.00E-03
FAIL
-1.97E-02
3.43E-04
-1.88E-02
-2.06E-02
-8.00E-03
FAIL
-1.98E-02
3.60E-04
-1.88E-02
-2.08E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
358
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 3V #2 (A)
5.00E-03
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.176. Plot of Positive Short-Circuit Current @ 3V #2 (A) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
359
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.176. Raw data for Positive Short-Circuit Current @ 3V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 3V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.03E-02
-2.00E-02
-2.15E-02
-1.99E-02
-2.12E-02
-2.05E-02
-2.04E-02
-2.15E-02
-2.09E-02
-2.04E-02
-2.05E-02
10
-1.90E-02
-1.85E-02
-1.97E-02
-1.84E-02
-1.98E-02
-2.01E-02
-1.99E-02
-2.10E-02
-2.04E-02
-2.00E-02
-2.05E-02
20
-1.93E-02
-1.92E-02
-2.07E-02
-1.90E-02
-2.02E-02
-2.02E-02
-2.00E-02
-2.11E-02
-2.05E-02
-2.01E-02
-2.05E-02
30
-1.90E-02
-1.85E-02
-1.97E-02
-1.84E-02
-1.98E-02
-2.01E-02
-1.99E-02
-2.10E-02
-2.04E-02
-2.00E-02
-2.05E-02
50
-4.74E-03
-8.12E-03
-6.85E-03
-2.69E-03
-5.83E-03
-2.00E-02
-1.97E-02
-2.08E-02
-2.02E-02
-1.98E-02
-2.05E-02
60
-5.19E-03
-8.63E-03
-7.47E-03
-3.14E-03
-6.36E-03
-2.00E-02
-1.98E-02
-2.08E-02
-2.02E-02
-1.98E-02
-2.05E-02
70
-1.95E-02
-1.93E-02
-2.08E-02
-1.91E-02
-2.03E-02
-2.01E-02
-1.99E-02
-2.10E-02
-2.04E-02
-1.99E-02
-2.05E-02
-2.06E-02
7.27E-04
-1.86E-02
-2.26E-02
-1.91E-02
6.70E-04
-1.73E-02
-2.09E-02
-1.97E-02
7.48E-04
-1.76E-02
-2.17E-02
-1.91E-02
6.70E-04
-1.73E-02
-2.09E-02
-5.65E-03
2.07E-03
3.38E-05
-1.13E-02
-6.16E-03
2.12E-03
-3.55E-04
-1.20E-02
-1.98E-02
7.34E-04
-1.78E-02
-2.18E-02
-2.07E-02
4.69E-04
-1.95E-02
-2.20E-02
-1.20E-02
PASS
-2.03E-02
4.37E-04
-1.91E-02
-2.15E-02
-8.00E-03
PASS
-2.04E-02
4.45E-04
-1.91E-02
-2.16E-02
-8.00E-03
PASS
-2.03E-02
4.37E-04
-1.91E-02
-2.15E-02
-8.00E-03
PASS
-2.01E-02
4.32E-04
-1.89E-02
-2.13E-02
-8.00E-03
FAIL
-2.01E-02
4.35E-04
-1.89E-02
-2.13E-02
-8.00E-03
FAIL
-2.03E-02
4.38E-04
-1.91E-02
-2.15E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
360
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 3V #3 (A)
5.00E-03
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.177. Plot of Positive Short-Circuit Current @ 3V #3 (A) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
361
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.177. Raw data for Positive Short-Circuit Current @ 3V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 3V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.03E-02
-1.99E-02
-2.16E-02
-1.99E-02
-2.09E-02
-2.05E-02
-2.05E-02
-2.14E-02
-2.08E-02
-2.04E-02
-2.05E-02
10
-1.90E-02
-1.84E-02
-2.03E-02
-1.85E-02
-1.87E-02
-2.01E-02
-2.01E-02
-2.09E-02
-2.02E-02
-1.99E-02
-2.05E-02
20
-1.93E-02
-1.90E-02
-2.08E-02
-1.90E-02
-1.99E-02
-2.02E-02
-2.02E-02
-2.10E-02
-2.03E-02
-2.00E-02
-2.05E-02
30
-1.90E-02
-1.84E-02
-2.03E-02
-1.85E-02
-1.87E-02
-2.01E-02
-2.01E-02
-2.09E-02
-2.02E-02
-1.99E-02
-2.05E-02
50
-4.71E-03
-8.35E-03
-8.09E-03
-2.79E-03
-3.82E-03
-1.99E-02
-1.99E-02
-2.07E-02
-2.00E-02
-1.97E-02
-2.05E-02
60
-5.13E-03
-8.87E-03
-8.73E-03
-3.23E-03
-4.34E-03
-1.99E-02
-1.99E-02
-2.08E-02
-2.01E-02
-1.98E-02
-2.05E-02
70
-1.95E-02
-1.92E-02
-2.09E-02
-1.91E-02
-2.01E-02
-2.01E-02
-2.01E-02
-2.09E-02
-2.02E-02
-1.99E-02
-2.05E-02
-2.05E-02
7.40E-04
-1.85E-02
-2.25E-02
-1.90E-02
7.71E-04
-1.68E-02
-2.11E-02
-1.96E-02
7.73E-04
-1.75E-02
-2.17E-02
-1.90E-02
7.71E-04
-1.68E-02
-2.11E-02
-5.55E-03
2.53E-03
1.39E-03
-1.25E-02
-6.06E-03
2.59E-03
1.05E-03
-1.32E-02
-1.98E-02
7.50E-04
-1.77E-02
-2.18E-02
-2.07E-02
4.27E-04
-1.95E-02
-2.19E-02
-1.20E-02
PASS
-2.02E-02
4.02E-04
-1.91E-02
-2.13E-02
-8.00E-03
PASS
-2.03E-02
4.08E-04
-1.92E-02
-2.15E-02
-8.00E-03
PASS
-2.02E-02
4.02E-04
-1.91E-02
-2.13E-02
-8.00E-03
PASS
-2.00E-02
3.91E-04
-1.90E-02
-2.11E-02
-8.00E-03
FAIL
-2.01E-02
3.99E-04
-1.90E-02
-2.12E-02
-8.00E-03
FAIL
-2.02E-02
3.99E-04
-1.91E-02
-2.13E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
362
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 3V #4 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.178. Plot of Positive Short-Circuit Current @ 3V #4 (A) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
363
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.178. Raw data for Positive Short-Circuit Current @ 3V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 3V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.99E-02
-2.07E-02
-2.02E-02
-2.08E-02
-2.04E-02
-1.99E-02
-2.06E-02
-2.03E-02
-2.08E-02
-2.01E-02
-2.01E-02
10
-1.89E-02
-1.93E-02
-1.89E-02
-1.97E-02
-1.92E-02
-1.94E-02
-2.02E-02
-1.98E-02
-2.03E-02
-1.97E-02
-2.01E-02
20
-1.91E-02
-2.00E-02
-1.94E-02
-2.00E-02
-1.96E-02
-1.95E-02
-2.03E-02
-1.99E-02
-2.04E-02
-1.98E-02
-2.01E-02
30
-1.89E-02
-1.93E-02
-1.89E-02
-1.97E-02
-1.92E-02
-1.94E-02
-2.02E-02
-1.98E-02
-2.03E-02
-1.97E-02
-2.01E-02
50
-9.15E-03
-8.33E-03
-7.65E-03
-8.10E-03
-7.41E-03
-1.92E-02
-2.00E-02
-1.97E-02
-2.01E-02
-1.95E-02
-2.01E-02
60
-9.60E-03
-8.84E-03
-8.20E-03
-8.59E-03
-7.94E-03
-1.93E-02
-2.00E-02
-1.97E-02
-2.01E-02
-1.95E-02
-2.01E-02
70
-1.92E-02
-2.01E-02
-1.96E-02
-2.01E-02
-1.97E-02
-1.94E-02
-2.02E-02
-1.98E-02
-2.03E-02
-1.97E-02
-2.01E-02
-2.04E-02
3.80E-04
-1.93E-02
-2.14E-02
-1.92E-02
3.48E-04
-1.82E-02
-2.02E-02
-1.96E-02
3.85E-04
-1.85E-02
-2.06E-02
-1.92E-02
3.48E-04
-1.82E-02
-2.02E-02
-8.13E-03
6.76E-04
-6.27E-03
-9.98E-03
-8.63E-03
6.42E-04
-6.87E-03
-1.04E-02
-1.97E-02
3.95E-04
-1.86E-02
-2.08E-02
-2.03E-02
3.94E-04
-1.93E-02
-2.14E-02
-1.20E-02
PASS
-1.99E-02
3.58E-04
-1.89E-02
-2.09E-02
-8.00E-03
PASS
-2.00E-02
3.62E-04
-1.90E-02
-2.10E-02
-8.00E-03
PASS
-1.99E-02
3.58E-04
-1.89E-02
-2.09E-02
-8.00E-03
PASS
-1.97E-02
3.41E-04
-1.87E-02
-2.06E-02
-8.00E-03
FAIL
-1.97E-02
3.52E-04
-1.88E-02
-2.07E-02
-8.00E-03
FAIL
-1.99E-02
3.60E-04
-1.89E-02
-2.08E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
364
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 3V #1 (A)
5.00E-02
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.179. Plot of Negative Short-Circuit Current @ 3V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
365
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.179. Raw data for Negative Short-Circuit Current @ 3V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 3V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.43E-02
4.55E-02
4.55E-02
4.63E-02
4.57E-02
4.45E-02
4.57E-02
4.51E-02
4.58E-02
4.49E-02
4.48E-02
10
4.38E-02
4.52E-02
4.53E-02
4.61E-02
4.55E-02
4.45E-02
4.56E-02
4.51E-02
4.57E-02
4.49E-02
4.50E-02
20
4.41E-02
4.53E-02
4.53E-02
4.60E-02
4.55E-02
4.46E-02
4.57E-02
4.52E-02
4.59E-02
4.51E-02
4.51E-02
30
4.38E-02
4.52E-02
4.53E-02
4.61E-02
4.55E-02
4.45E-02
4.56E-02
4.51E-02
4.57E-02
4.49E-02
4.50E-02
50
4.44E-02
4.57E-02
4.57E-02
4.67E-02
4.60E-02
4.43E-02
4.54E-02
4.49E-02
4.55E-02
4.47E-02
4.49E-02
60
4.41E-02
4.54E-02
4.54E-02
4.64E-02
4.57E-02
4.41E-02
4.52E-02
4.47E-02
4.53E-02
4.45E-02
4.48E-02
70
4.40E-02
4.52E-02
4.52E-02
4.60E-02
4.54E-02
4.45E-02
4.56E-02
4.51E-02
4.57E-02
4.49E-02
4.51E-02
4.54E-02
7.19E-04
4.74E-02
4.35E-02
4.52E-02
8.54E-04
4.75E-02
4.28E-02
4.52E-02
7.18E-04
4.72E-02
4.33E-02
4.52E-02
8.54E-04
4.75E-02
4.28E-02
4.57E-02
8.39E-04
4.80E-02
4.34E-02
4.54E-02
8.18E-04
4.76E-02
4.31E-02
4.51E-02
7.28E-04
4.71E-02
4.31E-02
4.52E-02
5.32E-04
4.66E-02
4.37E-02
1.20E-02
PASS
4.51E-02
5.14E-04
4.66E-02
4.37E-02
8.00E-03
PASS
4.53E-02
5.25E-04
4.67E-02
4.38E-02
8.00E-03
PASS
4.51E-02
5.14E-04
4.66E-02
4.37E-02
8.00E-03
PASS
4.50E-02
5.04E-04
4.63E-02
4.36E-02
8.00E-03
PASS
4.47E-02
4.98E-04
4.61E-02
4.34E-02
8.00E-03
PASS
4.51E-02
5.04E-04
4.65E-02
4.38E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
366
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 3V #2 (A)
5.00E-02
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.180. Plot of Negative Short-Circuit Current @ 3V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
367
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.180. Raw data for Negative Short-Circuit Current @ 3V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 3V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.48E-02
4.43E-02
4.65E-02
4.42E-02
4.49E-02
4.55E-02
4.53E-02
4.54E-02
4.53E-02
4.49E-02
4.52E-02
10
4.45E-02
4.42E-02
4.65E-02
4.41E-02
4.48E-02
4.55E-02
4.52E-02
4.54E-02
4.53E-02
4.49E-02
4.54E-02
20
4.46E-02
4.41E-02
4.63E-02
4.39E-02
4.47E-02
4.56E-02
4.53E-02
4.55E-02
4.54E-02
4.51E-02
4.55E-02
30
4.45E-02
4.42E-02
4.65E-02
4.41E-02
4.48E-02
4.55E-02
4.52E-02
4.54E-02
4.53E-02
4.49E-02
4.54E-02
50
4.50E-02
4.45E-02
4.68E-02
4.47E-02
4.53E-02
4.53E-02
4.50E-02
4.52E-02
4.51E-02
4.47E-02
4.53E-02
60
4.47E-02
4.42E-02
4.65E-02
4.43E-02
4.50E-02
4.51E-02
4.48E-02
4.50E-02
4.48E-02
4.45E-02
4.51E-02
70
4.45E-02
4.40E-02
4.62E-02
4.39E-02
4.46E-02
4.55E-02
4.52E-02
4.54E-02
4.53E-02
4.49E-02
4.54E-02
4.50E-02
9.27E-04
4.75E-02
4.24E-02
4.48E-02
9.72E-04
4.75E-02
4.21E-02
4.47E-02
9.47E-04
4.73E-02
4.21E-02
4.48E-02
9.72E-04
4.75E-02
4.21E-02
4.53E-02
9.37E-04
4.78E-02
4.27E-02
4.50E-02
9.27E-04
4.75E-02
4.24E-02
4.46E-02
9.18E-04
4.71E-02
4.21E-02
4.53E-02
2.23E-04
4.59E-02
4.47E-02
1.20E-02
PASS
4.52E-02
2.45E-04
4.59E-02
4.46E-02
8.00E-03
PASS
4.54E-02
2.09E-04
4.60E-02
4.48E-02
8.00E-03
PASS
4.52E-02
2.45E-04
4.59E-02
4.46E-02
8.00E-03
PASS
4.51E-02
2.40E-04
4.57E-02
4.44E-02
8.00E-03
PASS
4.48E-02
2.32E-04
4.55E-02
4.42E-02
8.00E-03
PASS
4.53E-02
2.34E-04
4.59E-02
4.46E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
368
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 3V #3 (A)
5.00E-02
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.181. Plot of Negative Short-Circuit Current @ 3V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
369
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.181. Raw data for Negative Short-Circuit Current @ 3V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 3V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.53E-02
4.47E-02
4.69E-02
4.47E-02
4.54E-02
4.58E-02
4.59E-02
4.59E-02
4.58E-02
4.55E-02
4.57E-02
10
4.49E-02
4.45E-02
4.68E-02
4.46E-02
4.53E-02
4.58E-02
4.58E-02
4.58E-02
4.58E-02
4.54E-02
4.59E-02
20
4.51E-02
4.44E-02
4.66E-02
4.45E-02
4.52E-02
4.59E-02
4.59E-02
4.59E-02
4.59E-02
4.56E-02
4.60E-02
30
4.49E-02
4.45E-02
4.68E-02
4.46E-02
4.53E-02
4.58E-02
4.58E-02
4.58E-02
4.58E-02
4.54E-02
4.59E-02
50
4.55E-02
4.48E-02
4.71E-02
4.52E-02
4.58E-02
4.57E-02
4.56E-02
4.56E-02
4.55E-02
4.52E-02
4.58E-02
60
4.52E-02
4.45E-02
4.68E-02
4.48E-02
4.55E-02
4.54E-02
4.54E-02
4.54E-02
4.53E-02
4.50E-02
4.56E-02
70
4.50E-02
4.44E-02
4.65E-02
4.44E-02
4.51E-02
4.59E-02
4.58E-02
4.58E-02
4.57E-02
4.55E-02
4.59E-02
4.54E-02
8.91E-04
4.78E-02
4.29E-02
4.52E-02
9.15E-04
4.77E-02
4.27E-02
4.52E-02
9.00E-04
4.76E-02
4.27E-02
4.52E-02
9.15E-04
4.77E-02
4.27E-02
4.57E-02
8.96E-04
4.81E-02
4.32E-02
4.54E-02
8.90E-04
4.78E-02
4.29E-02
4.51E-02
8.84E-04
4.75E-02
4.26E-02
4.58E-02
1.74E-04
4.62E-02
4.53E-02
1.20E-02
PASS
4.57E-02
1.78E-04
4.62E-02
4.52E-02
8.00E-03
PASS
4.59E-02
1.45E-04
4.63E-02
4.55E-02
8.00E-03
PASS
4.57E-02
1.78E-04
4.62E-02
4.52E-02
8.00E-03
PASS
4.55E-02
1.72E-04
4.60E-02
4.51E-02
8.00E-03
PASS
4.53E-02
1.65E-04
4.58E-02
4.49E-02
8.00E-03
PASS
4.57E-02
1.58E-04
4.62E-02
4.53E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
370
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 3V #4 (A)
5.00E-02
4.50E-02
4.00E-02
3.50E-02
3.00E-02
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.182. Plot of Negative Short-Circuit Current @ 3V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
371
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.182. Raw data for Negative Short-Circuit Current @ 3V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 3V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.36E-02
4.49E-02
4.49E-02
4.54E-02
4.49E-02
4.39E-02
4.50E-02
4.44E-02
4.52E-02
4.41E-02
4.41E-02
10
4.32E-02
4.48E-02
4.48E-02
4.51E-02
4.48E-02
4.39E-02
4.50E-02
4.44E-02
4.51E-02
4.40E-02
4.43E-02
20
4.34E-02
4.47E-02
4.47E-02
4.51E-02
4.48E-02
4.39E-02
4.51E-02
4.45E-02
4.53E-02
4.42E-02
4.45E-02
30
4.32E-02
4.48E-02
4.48E-02
4.51E-02
4.48E-02
4.39E-02
4.50E-02
4.44E-02
4.51E-02
4.40E-02
4.43E-02
50
4.37E-02
4.52E-02
4.52E-02
4.58E-02
4.53E-02
4.36E-02
4.48E-02
4.43E-02
4.49E-02
4.39E-02
4.42E-02
60
4.34E-02
4.48E-02
4.49E-02
4.54E-02
4.50E-02
4.35E-02
4.46E-02
4.40E-02
4.47E-02
4.37E-02
4.41E-02
70
4.33E-02
4.46E-02
4.46E-02
4.51E-02
4.47E-02
4.39E-02
4.50E-02
4.44E-02
4.51E-02
4.41E-02
4.44E-02
4.47E-02
6.71E-04
4.66E-02
4.29E-02
4.45E-02
7.71E-04
4.66E-02
4.24E-02
4.45E-02
6.60E-04
4.63E-02
4.27E-02
4.45E-02
7.71E-04
4.66E-02
4.24E-02
4.50E-02
7.85E-04
4.72E-02
4.29E-02
4.47E-02
7.60E-04
4.68E-02
4.26E-02
4.44E-02
6.78E-04
4.63E-02
4.26E-02
4.45E-02
5.87E-04
4.61E-02
4.29E-02
1.20E-02
PASS
4.45E-02
5.61E-04
4.60E-02
4.29E-02
8.00E-03
PASS
4.46E-02
5.74E-04
4.62E-02
4.30E-02
8.00E-03
PASS
4.45E-02
5.61E-04
4.60E-02
4.29E-02
8.00E-03
PASS
4.43E-02
5.50E-04
4.58E-02
4.28E-02
8.00E-03
PASS
4.41E-02
5.50E-04
4.56E-02
4.26E-02
8.00E-03
PASS
4.45E-02
5.46E-04
4.60E-02
4.30E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
372
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Supply Current @ 5V (A)
9.00E-03
8.50E-03
8.00E-03
7.50E-03
7.00E-03
6.50E-03
6.00E-03
5.50E-03
5.00E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.183. Plot of Positive Supply Current @ 5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
373
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.183. Raw data for Positive Supply Current @ 5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Supply Current @ 5V (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.40E-03
7.55E-03
7.49E-03
7.36E-03
7.48E-03
7.49E-03
7.57E-03
7.68E-03
7.33E-03
7.63E-03
7.62E-03
10
7.31E-03
7.42E-03
7.38E-03
7.25E-03
7.36E-03
7.45E-03
7.48E-03
7.63E-03
7.24E-03
7.57E-03
7.60E-03
20
7.24E-03
7.37E-03
7.33E-03
7.19E-03
7.29E-03
7.43E-03
7.46E-03
7.62E-03
7.22E-03
7.56E-03
7.60E-03
30
7.20E-03
7.33E-03
7.30E-03
7.16E-03
7.26E-03
7.42E-03
7.45E-03
7.60E-03
7.20E-03
7.54E-03
7.61E-03
50
7.09E-03
7.24E-03
7.21E-03
7.06E-03
7.16E-03
7.38E-03
7.41E-03
7.56E-03
7.16E-03
7.50E-03
7.61E-03
60
7.11E-03
7.26E-03
7.22E-03
7.08E-03
7.18E-03
7.40E-03
7.43E-03
7.59E-03
7.18E-03
7.52E-03
7.61E-03
70
7.19E-03
7.34E-03
7.30E-03
7.15E-03
7.26E-03
7.40E-03
7.43E-03
7.58E-03
7.19E-03
7.52E-03
7.61E-03
7.46E-03
7.57E-05
7.66E-03
7.25E-03
7.34E-03
6.58E-05
7.52E-03
7.16E-03
7.28E-03
7.13E-05
7.48E-03
7.09E-03
7.25E-03
7.00E-05
7.44E-03
7.06E-03
7.15E-03
7.66E-05
7.36E-03
6.94E-03
7.17E-03
7.48E-05
7.38E-03
6.96E-03
7.25E-03
7.79E-05
7.46E-03
7.03E-03
7.54E-03
1.37E-04
7.92E-03
7.16E-03
8.80E-03
PASS
7.47E-03
1.49E-04
7.88E-03
7.07E-03
8.80E-03
PASS
7.46E-03
1.53E-04
7.88E-03
7.04E-03
8.80E-03
PASS
7.44E-03
1.53E-04
7.86E-03
7.02E-03
8.80E-03
PASS
7.40E-03
1.53E-04
7.82E-03
6.98E-03
8.80E-03
PASS
7.42E-03
1.56E-04
7.85E-03
7.00E-03
8.80E-03
PASS
7.42E-03
1.49E-04
7.83E-03
7.02E-03
8.80E-03
PASS
An ISO 9001:2000 Certified Company
374
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Supply Current @ 5V (A)
-5.00E-03
-5.50E-03
-6.00E-03
-6.50E-03
-7.00E-03
-7.50E-03
-8.00E-03
-8.50E-03
-9.00E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.184. Plot of Negative Supply Current @ 5V (A) versus total dose. The data show no significant
change with radiation. The solid diamonds are the average of the measured data points for the sample
irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the
units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum
and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
375
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.184. Raw data for Negative Supply Current @ 5V (A) versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Supply Current @ 5V (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
-7.39E-03
-7.54E-03
-7.48E-03
-7.35E-03
-7.47E-03
-7.48E-03
-7.56E-03
-7.68E-03
-7.32E-03
-7.63E-03
-7.61E-03
10
-7.30E-03
-7.42E-03
-7.37E-03
-7.24E-03
-7.35E-03
-7.45E-03
-7.47E-03
-7.63E-03
-7.24E-03
-7.56E-03
-7.59E-03
20
-7.23E-03
-7.36E-03
-7.32E-03
-7.18E-03
-7.28E-03
-7.42E-03
-7.45E-03
-7.61E-03
-7.22E-03
-7.54E-03
-7.59E-03
30
-7.19E-03
-7.32E-03
-7.29E-03
-7.15E-03
-7.25E-03
-7.41E-03
-7.44E-03
-7.60E-03
-7.20E-03
-7.53E-03
-7.60E-03
50
-7.08E-03
-7.23E-03
-7.20E-03
-7.05E-03
-7.15E-03
-7.38E-03
-7.40E-03
-7.56E-03
-7.16E-03
-7.49E-03
-7.61E-03
60
-7.10E-03
-7.25E-03
-7.21E-03
-7.07E-03
-7.17E-03
-7.39E-03
-7.42E-03
-7.58E-03
-7.17E-03
-7.52E-03
-7.60E-03
70
-7.18E-03
-7.34E-03
-7.29E-03
-7.15E-03
-7.25E-03
-7.40E-03
-7.42E-03
-7.57E-03
-7.18E-03
-7.51E-03
-7.60E-03
-7.45E-03
7.57E-05
-7.24E-03
-7.65E-03
-7.34E-03
6.88E-05
-7.15E-03
-7.52E-03
-7.27E-03
7.13E-05
-7.08E-03
-7.47E-03
-7.24E-03
7.00E-05
-7.05E-03
-7.43E-03
-7.14E-03
7.66E-05
-6.93E-03
-7.35E-03
-7.16E-03
7.48E-05
-6.95E-03
-7.37E-03
-7.24E-03
7.79E-05
-7.03E-03
-7.46E-03
-7.53E-03
1.41E-04
-7.15E-03
-7.92E-03
-8.80E-03
PASS
-7.47E-03
1.47E-04
-7.07E-03
-7.87E-03
-8.80E-03
PASS
-7.45E-03
1.48E-04
-7.04E-03
-7.85E-03
-8.80E-03
PASS
-7.44E-03
1.52E-04
-7.02E-03
-7.85E-03
-8.80E-03
PASS
-7.40E-03
1.51E-04
-6.98E-03
-7.81E-03
-8.80E-03
PASS
-7.42E-03
1.57E-04
-6.98E-03
-7.85E-03
-8.80E-03
PASS
-7.42E-03
1.49E-04
-7.01E-03
-7.82E-03
-8.80E-03
PASS
An ISO 9001:2000 Certified Company
376
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=0V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.185. Plot of Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
377
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.185. Raw data for Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=0V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.28E-04
1.27E-04
-1.43E-04
5.65E-05
-1.11E-04
-1.16E-04
-3.39E-04
6.21E-05
-3.96E-05
-8.45E-05
-3.01E-04
10
-3.28E-04
9.69E-05
-1.68E-04
4.35E-05
-1.36E-04
-1.25E-04
-3.49E-04
4.86E-05
-5.38E-05
-9.66E-05
-3.04E-04
20
-3.12E-04
8.97E-05
-1.64E-04
5.27E-05
-1.31E-04
-1.24E-04
-3.51E-04
4.41E-05
-5.31E-05
-9.48E-05
-3.05E-04
30
-3.05E-04
8.65E-05
-1.66E-04
5.50E-05
-1.21E-04
-1.26E-04
-3.52E-04
4.58E-05
-5.52E-05
-9.30E-05
-3.03E-04
50
-3.04E-04
7.76E-05
-1.70E-04
5.66E-05
-1.21E-04
-1.25E-04
-3.49E-04
4.47E-05
-5.54E-05
-9.18E-05
-3.04E-04
60
-3.04E-04
7.88E-05
-1.71E-04
5.90E-05
-1.18E-04
-1.26E-04
-3.46E-04
4.57E-05
-5.43E-05
-9.06E-05
-3.04E-04
70
-3.10E-04
8.39E-05
-1.72E-04
6.36E-05
-1.12E-04
-1.29E-04
-3.57E-04
4.64E-05
-6.10E-05
-1.02E-04
-3.05E-04
-7.95E-05
1.79E-04
4.11E-04
-5.70E-04
-9.84E-05
1.71E-04
3.71E-04
-5.68E-04
-9.30E-05
1.65E-04
3.60E-04
-5.46E-04
-9.02E-05
1.62E-04
3.54E-04
-5.35E-04
-9.22E-05
1.60E-04
3.47E-04
-5.32E-04
-9.10E-05
1.61E-04
3.51E-04
-5.33E-04
-8.95E-05
1.66E-04
3.65E-04
-5.44E-04
-1.03E-04
1.48E-04
3.02E-04
-5.09E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.15E-04
1.46E-04
2.86E-04
-5.16E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.16E-04
1.46E-04
2.84E-04
-5.16E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.16E-04
1.47E-04
2.86E-04
-5.18E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.15E-04
1.45E-04
2.83E-04
-5.14E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.14E-04
1.45E-04
2.82E-04
-5.11E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.21E-04
1.48E-04
2.86E-04
-5.27E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
378
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=0V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.186. Plot of Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
379
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.186. Raw data for Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=0V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
2.41E-04
3.27E-05
1.04E-04
5.11E-06
1.73E-04
4.88E-05
4.27E-06
-1.19E-04
-1.87E-04
-6.64E-05
-1.88E-04
10
2.23E-04
1.27E-05
8.91E-05
-9.51E-06
1.39E-04
3.52E-05
-2.87E-06
-1.28E-04
-1.88E-04
-8.50E-05
-1.91E-04
20
2.38E-04
2.06E-05
9.29E-05
5.59E-06
1.37E-04
3.64E-05
4.00E-08
-1.27E-04
-1.86E-04
-8.33E-05
-1.90E-04
30
2.36E-04
2.21E-05
9.65E-05
1.51E-05
1.43E-04
3.68E-05
-8.10E-07
-1.26E-04
-1.87E-04
-8.41E-05
-1.90E-04
50
2.33E-04
2.28E-05
9.57E-05
1.68E-05
1.34E-04
3.40E-05
-2.50E-06
-1.29E-04
-1.90E-04
-8.86E-05
-1.89E-04
60
2.35E-04
2.41E-05
9.71E-05
1.88E-05
1.41E-04
3.74E-05
-5.70E-07
-1.27E-04
-1.89E-04
-8.38E-05
-1.92E-04
70
2.41E-04
4.07E-05
6.58E-05
-1.90E-06
1.61E-04
3.83E-05
-7.57E-06
-1.23E-04
-1.98E-04
-7.84E-05
-1.89E-04
1.11E-04
9.78E-05
3.80E-04
-1.57E-04
9.08E-05
9.47E-05
3.50E-04
-1.69E-04
9.90E-05
9.47E-05
3.59E-04
-1.61E-04
1.03E-04
9.16E-05
3.54E-04
-1.49E-04
1.00E-04
8.90E-05
3.45E-04
-1.44E-04
1.03E-04
8.96E-05
3.49E-04
-1.43E-04
1.01E-04
9.82E-05
3.70E-04
-1.68E-04
-6.39E-05
9.43E-05
1.95E-04
-3.22E-04
-8.00E-04
PASS
8.00E-04
PASS
-7.36E-05
9.07E-05
1.75E-04
-3.22E-04
-9.50E-04
PASS
9.50E-04
PASS
-7.19E-05
9.09E-05
1.77E-04
-3.21E-04
-9.50E-04
PASS
9.50E-04
PASS
-7.23E-05
9.12E-05
1.78E-04
-3.22E-04
-9.50E-04
PASS
9.50E-04
PASS
-7.53E-05
9.15E-05
1.76E-04
-3.26E-04
-9.50E-04
PASS
9.50E-04
PASS
-7.27E-05
9.22E-05
1.80E-04
-3.25E-04
-9.50E-04
PASS
9.50E-04
PASS
-7.36E-05
9.32E-05
1.82E-04
-3.29E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
380
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=0V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.187. Plot of Input Offset Voltage @ 5V, VCM=0V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
381
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.187. Raw data for Input Offset Voltage @ 5V, VCM=0V #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=0V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-5.07E-05
-1.97E-04
-1.92E-04
-5.39E-06
-3.05E-05
-2.16E-05
-2.48E-05
-1.77E-04
-3.04E-04
-6.39E-05
-2.30E-04
10
-7.78E-05
-2.32E-04
-2.05E-04
-4.88E-05
-5.59E-05
-3.44E-05
-3.54E-05
-1.88E-04
-3.15E-04
-7.49E-05
-2.31E-04
20
-7.80E-05
-2.35E-04
-1.94E-04
-4.73E-05
-5.50E-05
-3.78E-05
-3.84E-05
-1.86E-04
-3.13E-04
-7.29E-05
-2.30E-04
30
-8.10E-05
-2.36E-04
-1.87E-04
-4.42E-05
-4.37E-05
-3.89E-05
-3.72E-05
-1.84E-04
-3.12E-04
-7.15E-05
-2.31E-04
50
-9.36E-05
-2.48E-04
-1.78E-04
-5.19E-05
-5.19E-05
-4.03E-05
-3.66E-05
-1.83E-04
-3.11E-04
-6.88E-05
-2.27E-04
60
-9.19E-05
-2.47E-04
-1.75E-04
-5.12E-05
-5.07E-05
-3.85E-05
-3.55E-05
-1.83E-04
-3.09E-04
-6.76E-05
-2.32E-04
70
-1.06E-04
-2.31E-04
-2.05E-04
-4.56E-05
-5.25E-05
-2.00E-05
-4.92E-05
-1.86E-04
-3.17E-04
-7.61E-05
-2.32E-04
-9.52E-05
9.22E-05
1.58E-04
-3.48E-04
-1.24E-04
8.77E-05
1.17E-04
-3.65E-04
-1.22E-04
8.66E-05
1.15E-04
-3.59E-04
-1.18E-04
8.82E-05
1.23E-04
-3.60E-04
-1.25E-04
8.59E-05
1.11E-04
-3.60E-04
-1.23E-04
8.57E-05
1.12E-04
-3.58E-04
-1.28E-04
8.59E-05
1.08E-04
-3.63E-04
-1.18E-04
1.21E-04
2.14E-04
-4.51E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.29E-04
1.21E-04
2.02E-04
-4.61E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.30E-04
1.19E-04
1.97E-04
-4.56E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.29E-04
1.19E-04
1.97E-04
-4.55E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.28E-04
1.18E-04
1.97E-04
-4.52E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.27E-04
1.18E-04
1.98E-04
-4.51E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.30E-04
1.22E-04
2.05E-04
-4.65E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
382
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=0V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.188. Plot of Input Offset Voltage @ 5V, VCM=0V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
383
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.188. Raw data for Input Offset Voltage @ 5V, VCM=0V #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=0V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-8.33E-05
1.85E-04
-3.42E-04
8.98E-06
-1.59E-04
-2.53E-05
-1.94E-04
-2.92E-04
1.19E-04
-5.65E-05
-5.50E-05
10
-9.61E-05
1.67E-04
-3.64E-04
-1.16E-05
-1.80E-04
-3.39E-05
-1.98E-04
-3.02E-04
1.01E-04
-6.69E-05
-5.69E-05
20
-8.49E-05
1.67E-04
-3.57E-04
-5.88E-06
-1.73E-04
-3.45E-05
-1.96E-04
-3.02E-04
1.02E-04
-6.71E-05
-5.85E-05
30
-7.97E-05
1.68E-04
-3.55E-04
-2.26E-06
-1.65E-04
-3.50E-05
-1.96E-04
-3.04E-04
1.02E-04
-6.91E-05
-5.60E-05
50
-7.15E-05
1.68E-04
-3.60E-04
4.00E-08
-1.65E-04
-3.70E-05
-1.96E-04
-3.01E-04
1.01E-04
-7.09E-05
-5.63E-05
60
-7.08E-05
1.71E-04
-3.61E-04
6.40E-07
-1.64E-04
-3.57E-05
-1.95E-04
-3.02E-04
1.04E-04
-6.98E-05
-5.72E-05
70
-7.99E-05
1.67E-04
-3.74E-04
4.75E-06
-1.69E-04
-3.43E-05
-2.14E-04
-3.09E-04
8.83E-05
-6.68E-05
-5.79E-05
-7.82E-05
1.96E-04
4.58E-04
-6.15E-04
-9.70E-05
1.97E-04
4.44E-04
-6.38E-04
-9.07E-05
1.94E-04
4.43E-04
-6.24E-04
-8.69E-05
1.94E-04
4.44E-04
-6.18E-04
-8.57E-05
1.96E-04
4.51E-04
-6.22E-04
-8.47E-05
1.97E-04
4.56E-04
-6.25E-04
-9.03E-05
2.01E-04
4.61E-04
-6.42E-04
-8.98E-05
1.58E-04
3.45E-04
-5.24E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.00E-04
1.55E-04
3.25E-04
-5.26E-04
-9.50E-04
PASS
9.50E-04
PASS
-9.96E-05
1.55E-04
3.25E-04
-5.25E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.00E-04
1.56E-04
3.26E-04
-5.27E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.01E-04
1.54E-04
3.22E-04
-5.23E-04
-9.50E-04
PASS
9.50E-04
PASS
-9.96E-05
1.55E-04
3.26E-04
-5.25E-04
-9.50E-04
PASS
9.50E-04
PASS
-1.07E-04
1.56E-04
3.21E-04
-5.35E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
384
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=0V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.189. Plot of Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
385
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.189. Raw data for Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=0V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.95E-10
7.42E-09
5.80E-11
4.74E-09
1.57E-10
-3.50E-09
4.45E-10
-6.79E-10
-3.53E-09
-2.56E-09
-7.15E-10
10
1.65E-10
7.00E-09
-6.53E-10
4.30E-09
-1.80E-10
-3.51E-09
3.18E-10
-1.10E-09
-3.09E-09
-2.96E-09
-6.95E-10
20
1.68E-10
6.95E-09
-6.29E-10
4.08E-09
-1.09E-10
-3.42E-09
-6.20E-11
-1.04E-09
-2.82E-09
-2.72E-09
-6.76E-10
30
2.79E-10
6.36E-09
-4.05E-10
3.94E-09
-1.85E-10
-3.41E-09
-6.52E-10
-8.67E-10
-3.24E-09
-3.26E-09
-7.32E-10
50
7.37E-10
6.03E-09
-8.14E-10
3.77E-09
-8.60E-11
-3.73E-09
1.59E-10
-8.83E-10
-3.27E-09
-3.01E-09
-7.09E-10
60
7.61E-10
5.90E-09
-7.69E-10
3.74E-09
-2.95E-10
-3.80E-09
5.30E-11
-6.50E-10
-2.67E-09
-3.38E-09
-7.26E-10
70
1.70E-11
5.94E-09
-1.12E-09
4.29E-09
1.07E-10
-4.10E-09
-5.17E-10
-8.88E-10
-3.03E-09
-3.26E-09
-7.08E-10
2.57E-09
3.34E-09
1.17E-08
-6.59E-09
2.13E-09
3.37E-09
1.14E-08
-7.11E-09
2.09E-09
3.30E-09
1.11E-08
-6.95E-09
2.00E-09
3.01E-09
1.03E-08
-6.26E-09
1.93E-09
2.88E-09
9.82E-09
-5.97E-09
1.87E-09
2.86E-09
9.70E-09
-5.96E-09
1.85E-09
3.08E-09
1.03E-08
-6.59E-09
-1.96E-09
1.78E-09
2.91E-09
-6.84E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.07E-09
1.62E-09
2.38E-09
-6.52E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.01E-09
1.40E-09
1.84E-09
-5.86E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.29E-09
1.40E-09
1.54E-09
-6.11E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.15E-09
1.69E-09
2.49E-09
-6.78E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.09E-09
1.70E-09
2.58E-09
-6.76E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.36E-09
1.57E-09
1.94E-09
-6.66E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
386
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=0V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.190. Plot of Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
387
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.190. Raw data for Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=0V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-1.13E-08
1.41E-10
1.16E-09
5.51E-09
1.43E-09
1.14E-09
2.01E-09
3.98E-09
-1.74E-09
9.64E-10
-5.28E-09
10
-1.11E-08
-3.00E-11
8.14E-10
5.58E-09
7.56E-10
1.54E-09
2.01E-09
3.92E-09
-1.39E-09
1.22E-09
-5.18E-09
20
-1.06E-08
1.26E-10
7.21E-10
5.21E-09
9.32E-10
1.62E-09
1.87E-09
3.78E-09
-1.87E-09
1.10E-09
-5.28E-09
30
-1.05E-08
2.42E-10
6.18E-10
5.37E-09
1.45E-09
1.58E-09
1.90E-09
4.17E-09
-1.72E-09
1.27E-09
-5.31E-09
50
-1.10E-08
-3.20E-10
1.95E-10
4.92E-09
1.27E-09
1.16E-09
9.68E-10
4.29E-09
-1.14E-09
1.31E-09
-5.27E-09
60
-1.09E-08
-5.10E-11
1.89E-10
4.96E-09
1.36E-09
1.37E-09
1.14E-09
4.09E-09
-1.24E-09
1.32E-09
-5.25E-09
70
-1.09E-08
1.74E-10
2.98E-10
5.53E-09
1.21E-09
1.27E-09
1.69E-09
3.77E-09
-1.70E-09
1.06E-09
-5.30E-09
-6.17E-10
6.32E-09
1.67E-08
-1.80E-08
-8.02E-10
6.19E-09
1.62E-08
-1.78E-08
-7.20E-10
5.87E-09
1.54E-08
-1.68E-08
-5.65E-10
5.92E-09
1.57E-08
-1.68E-08
-9.87E-10
5.96E-09
1.54E-08
-1.73E-08
-8.83E-10
5.93E-09
1.54E-08
-1.72E-08
-7.46E-10
6.10E-09
1.60E-08
-1.75E-08
1.27E-09
2.07E-09
6.93E-09
-4.40E-09
-6.50E-08
PASS
6.50E-08
PASS
1.46E-09
1.90E-09
6.68E-09
-3.76E-09
-6.50E-08
PASS
6.50E-08
PASS
1.30E-09
2.04E-09
6.90E-09
-4.30E-09
-6.50E-08
PASS
6.50E-08
PASS
1.44E-09
2.10E-09
7.21E-09
-4.33E-09
-6.50E-08
PASS
6.50E-08
PASS
1.32E-09
1.94E-09
6.63E-09
-4.00E-09
-6.50E-08
PASS
6.50E-08
PASS
1.34E-09
1.89E-09
6.52E-09
-3.84E-09
-6.50E-08
PASS
6.50E-08
PASS
1.22E-09
1.96E-09
6.58E-09
-4.15E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
388
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=0V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.191. Plot of Input Offset Current @ 5V, VCM=0V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
389
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.191. Raw data for Input Offset Current @ 5V, VCM=0V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=0V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-4.61E-10
-1.01E-09
4.59E-09
-1.13E-09
-2.95E-09
-4.15E-09
-3.23E-09
2.88E-09
2.53E-10
3.15E-09
2.39E-09
10
-8.65E-10
-1.21E-09
4.74E-09
-2.71E-09
-2.91E-09
-4.28E-09
-3.27E-09
3.00E-09
4.00E-12
2.73E-09
2.34E-09
20
-1.05E-09
-1.11E-09
4.72E-09
-2.21E-09
-2.54E-09
-4.00E-09
-3.32E-09
2.97E-09
3.35E-10
2.95E-09
2.39E-09
30
-9.60E-10
-8.68E-10
4.77E-09
-2.62E-09
-2.41E-09
-3.94E-09
-3.14E-09
3.83E-09
7.64E-10
3.17E-09
2.42E-09
50
-8.20E-10
-1.44E-09
4.62E-09
-2.42E-09
-2.40E-09
-3.11E-09
-3.12E-09
3.78E-09
1.05E-09
2.64E-09
2.42E-09
60
-8.70E-10
-1.18E-09
4.77E-09
-2.49E-09
-2.37E-09
-3.33E-09
-3.19E-09
3.58E-09
9.47E-10
2.88E-09
2.42E-09
70
-4.24E-10
-8.89E-10
5.02E-09
-1.86E-09
-3.16E-09
-3.77E-09
-3.25E-09
3.09E-09
7.69E-10
3.26E-09
2.40E-09
-1.93E-10
2.84E-09
7.58E-09
-7.97E-09
-5.90E-10
3.11E-09
7.93E-09
-9.11E-09
-4.36E-10
2.96E-09
7.68E-09
-8.55E-09
-4.19E-10
3.01E-09
7.83E-09
-8.67E-09
-4.93E-10
2.93E-09
7.55E-09
-8.54E-09
-4.26E-10
2.99E-09
7.77E-09
-8.63E-09
-2.63E-10
3.13E-09
8.32E-09
-8.85E-09
-2.21E-10
3.38E-09
9.04E-09
-9.49E-09
-6.50E-08
PASS
6.50E-08
PASS
-3.63E-10
3.35E-09
8.82E-09
-9.54E-09
-6.50E-08
PASS
6.50E-08
PASS
-2.12E-10
3.33E-09
8.92E-09
-9.35E-09
-6.50E-08
PASS
6.50E-08
PASS
1.37E-10
3.56E-09
9.89E-09
-9.61E-09
-6.50E-08
PASS
6.50E-08
PASS
2.47E-10
3.22E-09
9.07E-09
-8.57E-09
-6.50E-08
PASS
6.50E-08
PASS
1.78E-10
3.28E-09
9.17E-09
-8.82E-09
-6.50E-08
PASS
6.50E-08
PASS
1.96E-11
3.37E-09
9.27E-09
-9.23E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
390
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=0V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.192. Plot of Input Offset Current @ 5V, VCM=0V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
391
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.192. Raw data for Input Offset Current @ 5V, VCM=0V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=0V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.06E-09
3.76E-09
-4.40E-09
-1.63E-09
-1.45E-09
-1.56E-09
2.47E-09
-1.24E-08
-3.93E-09
-4.48E-09
-2.92E-10
10
-2.37E-09
4.31E-09
-4.33E-09
-1.30E-09
-1.50E-09
-2.03E-09
2.85E-09
-1.31E-08
-3.65E-09
-4.08E-09
-2.99E-10
20
-2.37E-09
4.07E-09
-4.48E-09
-1.33E-09
-1.97E-09
-1.57E-09
2.09E-09
-1.29E-08
-3.62E-09
-4.19E-09
-2.63E-10
30
-2.25E-09
4.36E-09
-4.56E-09
-1.29E-09
-1.70E-09
-1.44E-09
2.47E-09
-1.32E-08
-2.82E-09
-4.55E-09
-2.90E-10
50
-2.22E-09
4.30E-09
-4.16E-09
-5.93E-10
-2.18E-09
-1.64E-09
3.10E-09
-1.18E-08
-3.39E-09
-4.28E-09
-3.84E-10
60
-2.44E-09
4.19E-09
-4.25E-09
-5.99E-10
-2.13E-09
-1.60E-09
3.11E-09
-1.17E-08
-2.86E-09
-3.93E-09
-3.39E-10
70
-2.79E-09
4.53E-09
-3.66E-09
-1.26E-09
-1.84E-09
-2.03E-09
3.12E-09
-1.29E-08
-3.23E-09
-4.32E-09
-2.89E-10
-1.15E-09
2.99E-09
7.05E-09
-9.36E-09
-1.04E-09
3.22E-09
7.79E-09
-9.86E-09
-1.21E-09
3.18E-09
7.51E-09
-9.94E-09
-1.09E-09
3.30E-09
7.95E-09
-1.01E-08
-9.72E-10
3.21E-09
7.82E-09
-9.76E-09
-1.04E-09
3.20E-09
7.74E-09
-9.82E-09
-1.00E-09
3.23E-09
7.84E-09
-9.85E-09
-3.99E-09
5.46E-09
1.10E-08
-1.90E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.99E-09
5.77E-09
1.18E-08
-1.98E-08
-6.50E-08
PASS
6.50E-08
PASS
-4.04E-09
5.52E-09
1.11E-08
-1.92E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.92E-09
5.81E-09
1.20E-08
-1.99E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.60E-09
5.39E-09
1.12E-08
-1.84E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.39E-09
5.35E-09
1.13E-08
-1.81E-08
-6.50E-08
PASS
6.50E-08
PASS
-3.87E-09
5.79E-09
1.20E-08
-1.98E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
392
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=0V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.193. Plot of Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
393
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.193. Raw data for Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=0V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.35E-07
-3.06E-07
-3.02E-07
-3.21E-07
-3.32E-07
-3.33E-07
-3.25E-07
-3.14E-07
-3.07E-07
-3.09E-07
-3.29E-07
10
-3.40E-07
-3.13E-07
-3.08E-07
-3.26E-07
-3.37E-07
-3.47E-07
-3.46E-07
-3.28E-07
-3.22E-07
-3.24E-07
-3.30E-07
20
-3.41E-07
-3.16E-07
-3.11E-07
-3.28E-07
-3.39E-07
-3.53E-07
-3.52E-07
-3.34E-07
-3.27E-07
-3.29E-07
-3.30E-07
30
-3.41E-07
-3.18E-07
-3.12E-07
-3.28E-07
-3.39E-07
-3.59E-07
-3.58E-07
-3.38E-07
-3.32E-07
-3.34E-07
-3.29E-07
50
-3.44E-07
-3.21E-07
-3.15E-07
-3.30E-07
-3.46E-07
-3.66E-07
-3.65E-07
-3.50E-07
-3.39E-07
-3.48E-07
-3.29E-07
60
-3.44E-07
-3.20E-07
-3.14E-07
-3.29E-07
-3.41E-07
-3.65E-07
-3.65E-07
-3.49E-07
-3.38E-07
-3.40E-07
-3.29E-07
70
-3.38E-07
-3.15E-07
-3.09E-07
-3.26E-07
-3.37E-07
-3.50E-07
-3.48E-07
-3.32E-07
-3.25E-07
-3.28E-07
-3.29E-07
-3.19E-07
1.48E-08
-2.79E-07
-3.60E-07
-3.25E-07
1.40E-08
-2.86E-07
-3.63E-07
-3.27E-07
1.36E-08
-2.90E-07
-3.64E-07
-3.28E-07
1.30E-08
-2.92E-07
-3.63E-07
-3.31E-07
1.36E-08
-2.94E-07
-3.69E-07
-3.30E-07
1.30E-08
-2.94E-07
-3.65E-07
-3.25E-07
1.29E-08
-2.90E-07
-3.60E-07
-3.18E-07
1.09E-08
-2.88E-07
-3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.34E-07
1.23E-08
-3.00E-07
-3.67E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.25E-08
-3.05E-07
-3.74E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.44E-07
1.32E-08
-3.08E-07
-3.80E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.54E-07
1.16E-08
-3.22E-07
-3.85E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.51E-07
1.32E-08
-3.15E-07
-3.87E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.37E-07
1.17E-08
-3.05E-07
-3.69E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
394
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=0V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.194. Plot of Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
395
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.194. Raw data for Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=0V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.30E-07
-3.17E-07
-3.14E-07
-3.14E-07
-3.21E-07
-3.02E-07
-3.27E-07
-3.27E-07
-3.09E-07
-3.12E-07
-3.10E-07
10
-3.34E-07
-3.23E-07
-3.19E-07
-3.19E-07
-3.27E-07
-3.15E-07
-3.47E-07
-3.41E-07
-3.24E-07
-3.27E-07
-3.11E-07
20
-3.35E-07
-3.26E-07
-3.22E-07
-3.20E-07
-3.29E-07
-3.21E-07
-3.50E-07
-3.51E-07
-3.30E-07
-3.33E-07
-3.11E-07
30
-3.34E-07
-3.26E-07
-3.22E-07
-3.20E-07
-3.29E-07
-3.24E-07
-3.53E-07
-3.55E-07
-3.34E-07
-3.37E-07
-3.10E-07
50
-3.36E-07
-3.29E-07
-3.25E-07
-3.23E-07
-3.31E-07
-3.32E-07
-3.59E-07
-3.62E-07
-3.41E-07
-3.48E-07
-3.10E-07
60
-3.35E-07
-3.28E-07
-3.24E-07
-3.21E-07
-3.30E-07
-3.31E-07
-3.59E-07
-3.60E-07
-3.40E-07
-3.51E-07
-3.10E-07
70
-3.32E-07
-3.23E-07
-3.20E-07
-3.18E-07
-3.26E-07
-3.19E-07
-3.46E-07
-3.49E-07
-3.28E-07
-3.32E-07
-3.10E-07
-3.19E-07
6.76E-09
-3.01E-07
-3.38E-07
-3.25E-07
6.36E-09
-3.07E-07
-3.42E-07
-3.26E-07
5.86E-09
-3.10E-07
-3.42E-07
-3.26E-07
5.66E-09
-3.11E-07
-3.42E-07
-3.29E-07
5.12E-09
-3.15E-07
-3.43E-07
-3.28E-07
5.05E-09
-3.14E-07
-3.41E-07
-3.24E-07
5.73E-09
-3.08E-07
-3.40E-07
-3.16E-07
1.12E-08
-2.85E-07
-3.46E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.31E-07
1.30E-08
-2.95E-07
-3.67E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.37E-07
1.35E-08
-3.00E-07
-3.74E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.41E-07
1.32E-08
-3.05E-07
-3.77E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.49E-07
1.23E-08
-3.15E-07
-3.82E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.48E-07
1.29E-08
-3.13E-07
-3.84E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.35E-07
1.24E-08
-3.00E-07
-3.69E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
396
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=0V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.195. Plot of Positive Input Bias Current @ 5V, VCM=0V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
397
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.195. Raw data for Positive Input Bias Current @ 5V, VCM=0V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=0V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.13E-07
-3.18E-07
-3.16E-07
-3.21E-07
-3.20E-07
-3.05E-07
-3.30E-07
-3.30E-07
-3.08E-07
-3.12E-07
-3.08E-07
10
-3.18E-07
-3.24E-07
-3.22E-07
-3.26E-07
-3.26E-07
-3.17E-07
-3.48E-07
-3.48E-07
-3.23E-07
-3.27E-07
-3.09E-07
20
-3.19E-07
-3.27E-07
-3.24E-07
-3.28E-07
-3.28E-07
-3.22E-07
-3.52E-07
-3.54E-07
-3.29E-07
-3.33E-07
-3.09E-07
30
-3.19E-07
-3.28E-07
-3.25E-07
-3.27E-07
-3.27E-07
-3.27E-07
-3.59E-07
-3.57E-07
-3.33E-07
-3.38E-07
-3.09E-07
50
-3.20E-07
-3.31E-07
-3.27E-07
-3.29E-07
-3.29E-07
-3.34E-07
-3.63E-07
-3.65E-07
-3.41E-07
-3.51E-07
-3.08E-07
60
-3.20E-07
-3.30E-07
-3.26E-07
-3.28E-07
-3.28E-07
-3.32E-07
-3.62E-07
-3.63E-07
-3.39E-07
-3.49E-07
-3.08E-07
70
-3.17E-07
-3.25E-07
-3.22E-07
-3.25E-07
-3.25E-07
-3.21E-07
-3.49E-07
-3.51E-07
-3.27E-07
-3.31E-07
-3.08E-07
-3.18E-07
3.02E-09
-3.09E-07
-3.26E-07
-3.23E-07
3.39E-09
-3.14E-07
-3.33E-07
-3.25E-07
3.61E-09
-3.15E-07
-3.35E-07
-3.25E-07
3.66E-09
-3.15E-07
-3.35E-07
-3.27E-07
4.18E-09
-3.16E-07
-3.39E-07
-3.26E-07
4.10E-09
-3.15E-07
-3.38E-07
-3.23E-07
3.42E-09
-3.13E-07
-3.32E-07
-3.17E-07
1.20E-08
-2.84E-07
-3.50E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.33E-07
1.44E-08
-2.93E-07
-3.72E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.38E-07
1.41E-08
-3.00E-07
-3.77E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.43E-07
1.45E-08
-3.03E-07
-3.82E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.51E-07
1.38E-08
-3.13E-07
-3.89E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.49E-07
1.36E-08
-3.12E-07
-3.86E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.36E-07
1.33E-08
-2.99E-07
-3.72E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
398
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=0V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.196. Plot of Positive Input Bias Current @ 5V, VCM=0V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
399
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.196. Raw data for Positive Input Bias Current @ 5V, VCM=0V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=0V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.47E-07
-3.03E-07
-3.05E-07
-3.19E-07
-3.31E-07
-3.29E-07
-3.29E-07
-3.24E-07
-3.04E-07
-3.09E-07
-3.27E-07
10
-3.51E-07
-3.10E-07
-3.11E-07
-3.23E-07
-3.36E-07
-3.45E-07
-3.49E-07
-3.38E-07
-3.18E-07
-3.23E-07
-3.29E-07
20
-3.53E-07
-3.12E-07
-3.13E-07
-3.25E-07
-3.38E-07
-3.52E-07
-3.56E-07
-3.48E-07
-3.24E-07
-3.28E-07
-3.29E-07
30
-3.55E-07
-3.13E-07
-3.14E-07
-3.25E-07
-3.38E-07
-3.55E-07
-3.60E-07
-3.53E-07
-3.28E-07
-3.33E-07
-3.28E-07
50
-3.54E-07
-3.16E-07
-3.16E-07
-3.27E-07
-3.40E-07
-3.61E-07
-3.67E-07
-3.59E-07
-3.36E-07
-3.41E-07
-3.27E-07
60
-3.54E-07
-3.16E-07
-3.16E-07
-3.25E-07
-3.39E-07
-3.59E-07
-3.67E-07
-3.58E-07
-3.34E-07
-3.39E-07
-3.27E-07
70
-3.51E-07
-3.10E-07
-3.11E-07
-3.23E-07
-3.36E-07
-3.46E-07
-3.52E-07
-3.45E-07
-3.21E-07
-3.27E-07
-3.27E-07
-3.21E-07
1.84E-08
-2.70E-07
-3.71E-07
-3.26E-07
1.77E-08
-2.78E-07
-3.75E-07
-3.28E-07
1.75E-08
-2.80E-07
-3.76E-07
-3.29E-07
1.78E-08
-2.80E-07
-3.78E-07
-3.31E-07
1.62E-08
-2.86E-07
-3.75E-07
-3.30E-07
1.63E-08
-2.85E-07
-3.75E-07
-3.26E-07
1.73E-08
-2.79E-07
-3.74E-07
-3.19E-07
1.18E-08
-2.87E-07
-3.52E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.35E-07
1.34E-08
-2.98E-07
-3.71E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.42E-07
1.45E-08
-3.02E-07
-3.82E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.46E-07
1.44E-08
-3.06E-07
-3.85E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.53E-07
1.37E-08
-3.15E-07
-3.90E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.51E-07
1.41E-08
-3.12E-07
-3.90E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.38E-07
1.33E-08
-3.02E-07
-3.75E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
400
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=0V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.197. Plot of Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
401
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.197. Raw data for Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=0V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.36E-07
-3.14E-07
-3.03E-07
-3.25E-07
-3.32E-07
-3.29E-07
-3.26E-07
-3.13E-07
-3.04E-07
-3.07E-07
-3.28E-07
10
-3.40E-07
-3.21E-07
-3.08E-07
-3.31E-07
-3.37E-07
-3.48E-07
-3.48E-07
-3.27E-07
-3.19E-07
-3.21E-07
-3.30E-07
20
-3.45E-07
-3.23E-07
-3.10E-07
-3.32E-07
-3.39E-07
-3.53E-07
-3.54E-07
-3.33E-07
-3.25E-07
-3.27E-07
-3.30E-07
30
-3.46E-07
-3.24E-07
-3.11E-07
-3.32E-07
-3.39E-07
-3.57E-07
-3.60E-07
-3.37E-07
-3.29E-07
-3.31E-07
-3.29E-07
50
-3.46E-07
-3.28E-07
-3.14E-07
-3.34E-07
-3.48E-07
-3.63E-07
-3.69E-07
-3.52E-07
-3.36E-07
-3.39E-07
-3.28E-07
60
-3.46E-07
-3.26E-07
-3.13E-07
-3.33E-07
-3.41E-07
-3.62E-07
-3.65E-07
-3.48E-07
-3.35E-07
-3.37E-07
-3.28E-07
70
-3.39E-07
-3.21E-07
-3.08E-07
-3.30E-07
-3.37E-07
-3.48E-07
-3.51E-07
-3.31E-07
-3.22E-07
-3.25E-07
-3.29E-07
-3.22E-07
1.37E-08
-2.84E-07
-3.59E-07
-3.27E-07
1.32E-08
-2.91E-07
-3.63E-07
-3.30E-07
1.36E-08
-2.93E-07
-3.67E-07
-3.31E-07
1.33E-08
-2.94E-07
-3.67E-07
-3.34E-07
1.38E-08
-2.96E-07
-3.72E-07
-3.32E-07
1.28E-08
-2.97E-07
-3.67E-07
-3.27E-07
1.25E-08
-2.93E-07
-3.61E-07
-3.16E-07
1.13E-08
-2.85E-07
-3.47E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.33E-07
1.44E-08
-2.93E-07
-3.72E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.38E-07
1.44E-08
-2.99E-07
-3.78E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.43E-07
1.46E-08
-3.03E-07
-3.83E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.52E-07
1.42E-08
-3.13E-07
-3.91E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.49E-07
1.39E-08
-3.11E-07
-3.88E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.35E-07
1.30E-08
-3.00E-07
-3.71E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
402
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=0V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.198. Plot of Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
403
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.198. Raw data for Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=0V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.19E-07
-3.18E-07
-3.15E-07
-3.20E-07
-3.23E-07
-3.04E-07
-3.30E-07
-3.31E-07
-3.08E-07
-3.14E-07
-3.05E-07
10
-3.23E-07
-3.24E-07
-3.20E-07
-3.25E-07
-3.28E-07
-3.17E-07
-3.50E-07
-3.51E-07
-3.23E-07
-3.29E-07
-3.06E-07
20
-3.25E-07
-3.26E-07
-3.22E-07
-3.26E-07
-3.30E-07
-3.22E-07
-3.53E-07
-3.56E-07
-3.28E-07
-3.34E-07
-3.06E-07
30
-3.24E-07
-3.27E-07
-3.23E-07
-3.26E-07
-3.30E-07
-3.26E-07
-3.58E-07
-3.62E-07
-3.32E-07
-3.39E-07
-3.05E-07
50
-3.25E-07
-3.29E-07
-3.25E-07
-3.28E-07
-3.32E-07
-3.33E-07
-3.61E-07
-3.68E-07
-3.40E-07
-3.52E-07
-3.05E-07
60
-3.24E-07
-3.28E-07
-3.25E-07
-3.27E-07
-3.31E-07
-3.32E-07
-3.61E-07
-3.65E-07
-3.38E-07
-3.50E-07
-3.05E-07
70
-3.22E-07
-3.24E-07
-3.21E-07
-3.23E-07
-3.27E-07
-3.20E-07
-3.49E-07
-3.53E-07
-3.26E-07
-3.33E-07
-3.05E-07
-3.19E-07
2.78E-09
-3.11E-07
-3.27E-07
-3.24E-07
2.78E-09
-3.16E-07
-3.32E-07
-3.26E-07
2.72E-09
-3.18E-07
-3.33E-07
-3.26E-07
2.74E-09
-3.18E-07
-3.33E-07
-3.28E-07
2.94E-09
-3.20E-07
-3.36E-07
-3.27E-07
2.90E-09
-3.19E-07
-3.35E-07
-3.23E-07
2.58E-09
-3.16E-07
-3.30E-07
-3.17E-07
1.27E-08
-2.83E-07
-3.52E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.34E-07
1.57E-08
-2.91E-07
-3.77E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.51E-08
-2.97E-07
-3.80E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.43E-07
1.59E-08
-3.00E-07
-3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.51E-07
1.44E-08
-3.12E-07
-3.90E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.49E-07
1.43E-08
-3.10E-07
-3.89E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.36E-07
1.43E-08
-2.97E-07
-3.75E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
404
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=0V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.199. Plot of Negative Input Bias Current @ 5V, VCM=0V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
405
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.199. Raw data for Negative Input Bias Current @ 5V, VCM=0V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=0V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.13E-07
-3.17E-07
-3.21E-07
-3.20E-07
-3.17E-07
-3.01E-07
-3.27E-07
-3.33E-07
-3.09E-07
-3.16E-07
-3.11E-07
10
-3.18E-07
-3.23E-07
-3.27E-07
-3.24E-07
-3.23E-07
-3.13E-07
-3.41E-07
-3.54E-07
-3.24E-07
-3.30E-07
-3.12E-07
20
-3.19E-07
-3.26E-07
-3.29E-07
-3.25E-07
-3.25E-07
-3.19E-07
-3.50E-07
-3.58E-07
-3.30E-07
-3.36E-07
-3.12E-07
30
-3.18E-07
-3.27E-07
-3.30E-07
-3.26E-07
-3.25E-07
-3.23E-07
-3.54E-07
-3.62E-07
-3.34E-07
-3.47E-07
-3.11E-07
50
-3.20E-07
-3.30E-07
-3.32E-07
-3.27E-07
-3.27E-07
-3.31E-07
-3.61E-07
-3.69E-07
-3.47E-07
-3.54E-07
-3.11E-07
60
-3.19E-07
-3.29E-07
-3.31E-07
-3.26E-07
-3.26E-07
-3.29E-07
-3.59E-07
-3.69E-07
-3.41E-07
-3.53E-07
-3.11E-07
70
-3.17E-07
-3.24E-07
-3.27E-07
-3.23E-07
-3.22E-07
-3.18E-07
-3.47E-07
-3.55E-07
-3.28E-07
-3.35E-07
-3.11E-07
-3.18E-07
3.00E-09
-3.09E-07
-3.26E-07
-3.23E-07
3.34E-09
-3.14E-07
-3.32E-07
-3.25E-07
3.73E-09
-3.15E-07
-3.35E-07
-3.25E-07
4.15E-09
-3.14E-07
-3.37E-07
-3.27E-07
4.69E-09
-3.14E-07
-3.40E-07
-3.26E-07
4.72E-09
-3.13E-07
-3.39E-07
-3.22E-07
3.96E-09
-3.12E-07
-3.33E-07
-3.17E-07
1.31E-08
-2.81E-07
-3.53E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.32E-07
1.57E-08
-2.89E-07
-3.75E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.39E-07
1.58E-08
-2.95E-07
-3.82E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.44E-07
1.58E-08
-3.01E-07
-3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.53E-07
1.47E-08
-3.12E-07
-3.93E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.50E-07
1.56E-08
-3.07E-07
-3.93E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.36E-07
1.49E-08
-2.95E-07
-3.77E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
406
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=0V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.200. Plot of Negative Input Bias Current @ 5V, VCM=0V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
407
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.200. Raw data for Negative Input Bias Current @ 5V, VCM=0V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=0V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-3.47E-07
-3.07E-07
-3.01E-07
-3.17E-07
-3.30E-07
-3.28E-07
-3.32E-07
-3.12E-07
-3.00E-07
-3.05E-07
-3.27E-07
10
-3.50E-07
-3.14E-07
-3.07E-07
-3.22E-07
-3.35E-07
-3.40E-07
-3.53E-07
-3.25E-07
-3.15E-07
-3.19E-07
-3.29E-07
20
-3.52E-07
-3.17E-07
-3.08E-07
-3.24E-07
-3.36E-07
-3.51E-07
-3.59E-07
-3.31E-07
-3.21E-07
-3.24E-07
-3.28E-07
30
-3.53E-07
-3.18E-07
-3.09E-07
-3.24E-07
-3.36E-07
-3.55E-07
-3.64E-07
-3.35E-07
-3.25E-07
-3.28E-07
-3.28E-07
50
-3.53E-07
-3.21E-07
-3.12E-07
-3.26E-07
-3.38E-07
-3.61E-07
-3.71E-07
-3.48E-07
-3.32E-07
-3.37E-07
-3.27E-07
60
-3.53E-07
-3.20E-07
-3.12E-07
-3.25E-07
-3.37E-07
-3.58E-07
-3.70E-07
-3.48E-07
-3.31E-07
-3.35E-07
-3.27E-07
70
-3.50E-07
-3.15E-07
-3.08E-07
-3.22E-07
-3.34E-07
-3.45E-07
-3.57E-07
-3.30E-07
-3.18E-07
-3.23E-07
-3.27E-07
-3.20E-07
1.87E-08
-2.69E-07
-3.72E-07
-3.26E-07
1.74E-08
-2.78E-07
-3.73E-07
-3.27E-07
1.71E-08
-2.81E-07
-3.74E-07
-3.28E-07
1.71E-08
-2.81E-07
-3.75E-07
-3.30E-07
1.59E-08
-2.87E-07
-3.74E-07
-3.29E-07
1.61E-08
-2.85E-07
-3.73E-07
-3.26E-07
1.67E-08
-2.80E-07
-3.72E-07
-3.15E-07
1.39E-08
-2.77E-07
-3.54E-07
-6.50E-07
PASS
6.50E-07
PASS
-3.30E-07
1.58E-08
-2.87E-07
-3.74E-07
-7.00E-07
PASS
7.00E-07
PASS
-3.37E-07
1.69E-08
-2.91E-07
-3.83E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.42E-07
1.70E-08
-2.95E-07
-3.88E-07
-7.50E-07
PASS
7.50E-07
PASS
-3.50E-07
1.64E-08
-3.05E-07
-3.95E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.48E-07
1.62E-08
-3.04E-07
-3.93E-07
-8.00E-07
PASS
8.00E-07
PASS
-3.35E-07
1.60E-08
-2.91E-07
-3.79E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
408
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.201. Plot of Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
409
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.201. Raw data for Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.30E-05
1.55E-04
1.22E-04
2.04E-04
-9.36E-05
9.81E-05
-1.23E-04
-3.78E-05
2.63E-04
-1.75E-04
-2.47E-04
10
4.74E-06
1.29E-04
1.01E-04
1.92E-04
-1.07E-04
9.27E-05
-1.32E-04
-4.61E-05
2.53E-04
-1.76E-04
-2.50E-04
20
1.78E-05
1.23E-04
1.05E-04
2.00E-04
-9.94E-05
9.28E-05
-1.34E-04
-4.62E-05
2.57E-04
-1.73E-04
-2.50E-04
30
2.21E-05
1.20E-04
1.08E-04
2.01E-04
-9.51E-05
9.26E-05
-1.34E-04
-4.54E-05
2.57E-04
-1.71E-04
-2.49E-04
50
2.07E-05
1.13E-04
1.06E-04
2.03E-04
-9.36E-05
9.76E-05
-1.32E-04
-4.37E-05
2.59E-04
-1.68E-04
-2.50E-04
60
2.12E-05
1.13E-04
1.04E-04
2.06E-04
-9.21E-05
9.69E-05
-1.30E-04
-4.44E-05
2.60E-04
-1.68E-04
-2.50E-04
70
4.00E-08
1.15E-04
1.01E-04
1.98E-04
-7.59E-05
7.54E-05
-1.36E-04
-4.01E-05
2.52E-04
-1.51E-04
-2.51E-04
8.01E-05
1.20E-04
4.08E-04
-2.48E-04
6.40E-05
1.17E-04
3.85E-04
-2.57E-04
6.93E-05
1.14E-04
3.83E-04
-2.44E-04
7.13E-05
1.13E-04
3.80E-04
-2.38E-04
6.97E-05
1.12E-04
3.76E-04
-2.37E-04
7.04E-05
1.12E-04
3.77E-04
-2.37E-04
6.75E-05
1.07E-04
3.60E-04
-2.25E-04
5.04E-06
1.77E-04
4.91E-04
-4.81E-04
-8.00E-04
PASS
8.00E-04
PASS
-1.78E-06
1.76E-04
4.80E-04
-4.83E-04
-9.50E-04
PASS
9.50E-04
PASS
-7.10E-07
1.77E-04
4.84E-04
-4.85E-04
-9.50E-04
PASS
9.50E-04
PASS
-8.60E-08
1.76E-04
4.82E-04
-4.82E-04
-9.50E-04
PASS
9.50E-04
PASS
2.40E-06
1.76E-04
4.86E-04
-4.81E-04
-9.50E-04
PASS
9.50E-04
PASS
2.78E-06
1.76E-04
4.86E-04
-4.80E-04
-9.50E-04
PASS
9.50E-04
PASS
6.20E-08
1.68E-04
4.60E-04
-4.59E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
410
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.202. Plot of Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
411
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.202. Raw data for Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.92E-04
2.11E-04
2.72E-04
4.06E-04
4.26E-04
3.70E-04
1.80E-04
-1.16E-04
-6.85E-06
9.04E-05
-1.08E-04
10
1.79E-04
1.94E-04
2.55E-04
3.85E-04
3.96E-04
3.64E-04
1.80E-04
-1.20E-04
-8.42E-06
7.73E-05
-1.12E-04
20
1.94E-04
2.02E-04
2.58E-04
3.95E-04
3.92E-04
3.65E-04
1.85E-04
-1.18E-04
-6.24E-06
7.99E-05
-1.08E-04
30
1.92E-04
2.03E-04
2.62E-04
4.03E-04
3.96E-04
3.66E-04
1.87E-04
-1.17E-04
-9.51E-06
8.14E-05
-1.11E-04
50
1.96E-04
2.11E-04
2.63E-04
4.03E-04
3.90E-04
3.65E-04
1.87E-04
-1.18E-04
-8.66E-06
7.99E-05
-1.12E-04
60
2.00E-04
2.12E-04
2.62E-04
4.04E-04
3.92E-04
3.67E-04
1.90E-04
-1.18E-04
-8.54E-06
8.34E-05
-1.12E-04
70
1.86E-04
2.06E-04
2.42E-04
3.87E-04
3.99E-04
3.60E-04
1.77E-04
-1.24E-04
-1.74E-05
7.35E-05
-1.09E-04
3.01E-04
1.09E-04
6.00E-04
2.84E-06
2.82E-04
1.03E-04
5.65E-04
-1.59E-06
2.88E-04
9.95E-05
5.61E-04
1.52E-05
2.91E-04
1.02E-04
5.72E-04
1.07E-05
2.92E-04
9.82E-05
5.62E-04
2.31E-05
2.94E-04
9.80E-05
5.63E-04
2.52E-05
2.84E-04
1.02E-04
5.63E-04
5.50E-06
1.04E-04
1.85E-04
6.12E-04
-4.05E-04
-8.00E-04
PASS
8.00E-04
PASS
9.85E-05
1.85E-04
6.06E-04
-4.09E-04
-9.50E-04
PASS
9.50E-04
PASS
1.01E-04
1.85E-04
6.08E-04
-4.06E-04
-9.50E-04
PASS
9.50E-04
PASS
1.02E-04
1.85E-04
6.10E-04
-4.06E-04
-9.50E-04
PASS
9.50E-04
PASS
1.01E-04
1.85E-04
6.09E-04
-4.08E-04
-9.50E-04
PASS
9.50E-04
PASS
1.03E-04
1.86E-04
6.14E-04
-4.08E-04
-9.50E-04
PASS
9.50E-04
PASS
9.40E-05
1.86E-04
6.03E-04
-4.15E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
412
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.203. Plot of Input Offset Voltage @ 5V, VCM=5V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
413
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.203. Raw data for Input Offset Voltage @ 5V, VCM=5V #3 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.58E-05
1.17E-04
1.67E-04
2.88E-04
2.93E-05
1.14E-04
5.22E-05
2.38E-04
-1.58E-04
2.19E-04
1.31E-04
10
5.69E-05
7.55E-05
1.52E-04
2.45E-04
6.19E-06
1.05E-04
4.47E-05
2.30E-04
-1.66E-04
2.10E-04
1.30E-04
20
6.20E-05
7.00E-05
1.58E-04
2.47E-04
9.22E-06
1.05E-04
4.38E-05
2.31E-04
-1.63E-04
2.12E-04
1.30E-04
30
6.15E-05
6.84E-05
1.62E-04
2.52E-04
2.06E-05
1.05E-04
4.70E-05
2.34E-04
-1.63E-04
2.13E-04
1.30E-04
50
5.56E-05
5.33E-05
1.62E-04
2.47E-04
1.88E-05
1.07E-04
4.90E-05
2.34E-04
-1.60E-04
2.16E-04
1.30E-04
60
5.67E-05
5.38E-05
1.64E-04
2.49E-04
1.86E-05
1.09E-04
4.80E-05
2.35E-04
-1.58E-04
2.17E-04
1.29E-04
70
4.39E-05
6.68E-05
1.47E-04
2.62E-04
2.32E-05
1.10E-04
3.43E-05
2.28E-04
-1.66E-04
2.05E-04
1.28E-04
1.36E-04
9.94E-05
4.08E-04
-1.37E-04
1.07E-04
9.31E-05
3.62E-04
-1.48E-04
1.09E-04
9.36E-05
3.66E-04
-1.47E-04
1.13E-04
9.35E-05
3.69E-04
-1.43E-04
1.07E-04
9.48E-05
3.67E-04
-1.53E-04
1.09E-04
9.57E-05
3.71E-04
-1.54E-04
1.09E-04
9.79E-05
3.77E-04
-1.60E-04
9.31E-05
1.60E-04
5.31E-04
-3.44E-04
-8.00E-04
PASS
8.00E-04
PASS
8.47E-05
1.59E-04
5.22E-04
-3.52E-04
-9.50E-04
PASS
9.50E-04
PASS
8.57E-05
1.59E-04
5.21E-04
-3.50E-04
-9.50E-04
PASS
9.50E-04
PASS
8.75E-05
1.60E-04
5.25E-04
-3.50E-04
-9.50E-04
PASS
9.50E-04
PASS
8.91E-05
1.59E-04
5.25E-04
-3.47E-04
-9.50E-04
PASS
9.50E-04
PASS
9.02E-05
1.59E-04
5.26E-04
-3.45E-04
-9.50E-04
PASS
9.50E-04
PASS
8.22E-05
1.59E-04
5.17E-04
-3.53E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
414
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Voltage @ 5V, VCM=5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.50E-03
1.00E-03
5.00E-04
0.00E+00
-5.00E-04
-1.00E-03
-1.50E-03
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.204. Plot of Input Offset Voltage @ 5V, VCM=5V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
415
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.204. Raw data for Input Offset Voltage @ 5V, VCM=5V #4 (V) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Voltage @ 5V, VCM=5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-4.39E-05
3.01E-04
-1.54E-04
1.24E-04
-1.70E-04
1.55E-04
7.86E-05
5.95E-05
4.16E-04
6.59E-05
3.87E-05
10
-5.14E-05
2.82E-04
-1.76E-04
1.07E-04
-1.85E-04
1.49E-04
7.26E-05
5.66E-05
4.01E-04
6.49E-05
3.71E-05
20
-3.74E-05
2.84E-04
-1.69E-04
1.15E-04
-1.76E-04
1.51E-04
7.48E-05
6.06E-05
4.05E-04
6.56E-05
3.66E-05
30
-2.96E-05
2.85E-04
-1.67E-04
1.21E-04
-1.68E-04
1.50E-04
7.60E-05
6.16E-05
4.06E-04
6.49E-05
3.66E-05
50
-1.82E-05
2.85E-04
-1.73E-04
1.28E-04
-1.64E-04
1.51E-04
7.55E-05
6.71E-05
4.08E-04
6.35E-05
3.66E-05
60
-1.78E-05
2.87E-04
-1.71E-04
1.27E-04
-1.62E-04
1.52E-04
7.72E-05
6.65E-05
4.12E-04
6.56E-05
3.63E-05
70
-2.70E-05
2.85E-04
-1.68E-04
1.24E-04
-1.67E-04
1.50E-04
7.38E-05
6.29E-05
4.01E-04
5.97E-05
3.52E-05
1.13E-05
2.00E-04
5.59E-04
-5.37E-04
-4.68E-06
1.99E-04
5.42E-04
-5.51E-04
3.35E-06
1.97E-04
5.43E-04
-5.36E-04
8.34E-06
1.95E-04
5.43E-04
-5.27E-04
1.15E-05
1.96E-04
5.49E-04
-5.26E-04
1.25E-05
1.96E-04
5.50E-04
-5.25E-04
9.38E-06
1.96E-04
5.46E-04
-5.27E-04
1.55E-04
1.51E-04
5.68E-04
-2.58E-04
-8.00E-04
PASS
8.00E-04
PASS
1.49E-04
1.46E-04
5.49E-04
-2.51E-04
-9.50E-04
PASS
9.50E-04
PASS
1.51E-04
1.46E-04
5.52E-04
-2.50E-04
-9.50E-04
PASS
9.50E-04
PASS
1.52E-04
1.47E-04
5.55E-04
-2.51E-04
-9.50E-04
PASS
9.50E-04
PASS
1.53E-04
1.47E-04
5.57E-04
-2.51E-04
-9.50E-04
PASS
9.50E-04
PASS
1.55E-04
1.48E-04
5.61E-04
-2.52E-04
-9.50E-04
PASS
9.50E-04
PASS
1.49E-04
1.45E-04
5.48E-04
-2.49E-04
-9.50E-04
PASS
9.50E-04
PASS
An ISO 9001:2000 Certified Company
416
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=5V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.205. Plot of Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
417
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.205. Raw data for Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=5V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.10E-09
9.89E-09
7.85E-09
-5.33E-09
6.77E-09
-1.09E-08
-2.57E-08
-2.68E-09
-3.80E-09
7.72E-09
-6.26E-09
10
5.96E-09
1.03E-08
8.01E-09
-4.26E-09
1.11E-08
-9.68E-09
-2.78E-08
-9.81E-10
-3.64E-09
9.39E-09
-6.25E-09
20
4.59E-09
8.75E-09
6.82E-09
-5.27E-09
1.29E-08
-1.06E-08
-2.84E-08
-1.83E-09
-2.19E-09
1.06E-08
-6.25E-09
30
4.98E-09
7.68E-09
6.77E-09
-5.93E-09
9.64E-09
-9.59E-09
-2.77E-08
-2.36E-09
-2.97E-09
9.26E-09
-6.21E-09
50
6.07E-09
7.44E-09
7.06E-09
-6.18E-09
9.14E-09
-9.11E-09
-2.81E-08
-2.88E-09
-3.60E-09
9.91E-09
-6.04E-09
60
5.93E-09
7.25E-09
6.84E-09
-5.66E-09
9.30E-09
-8.53E-09
-2.79E-08
-2.97E-09
-3.35E-09
1.00E-08
-6.05E-09
70
4.12E-09
9.07E-09
7.38E-09
-5.77E-09
8.33E-09
-1.08E-08
-2.85E-08
-2.21E-09
-4.30E-09
8.62E-09
-6.17E-09
5.05E-09
5.98E-09
2.15E-08
-1.13E-08
6.22E-09
6.20E-09
2.32E-08
-1.08E-08
5.56E-09
6.79E-09
2.42E-08
-1.31E-08
4.63E-09
6.13E-09
2.14E-08
-1.22E-08
4.71E-09
6.19E-09
2.17E-08
-1.23E-08
4.73E-09
5.94E-09
2.10E-08
-1.15E-08
4.63E-09
6.11E-09
2.14E-08
-1.21E-08
-7.07E-09
1.24E-08
2.68E-08
-4.09E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.55E-09
1.38E-08
3.12E-08
-4.43E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.48E-09
1.44E-08
3.30E-08
-4.59E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.68E-09
1.36E-08
3.06E-08
-4.39E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.75E-09
1.38E-08
3.11E-08
-4.46E-08
-6.50E-08
PASS
6.50E-08
PASS
-6.56E-09
1.38E-08
3.12E-08
-4.43E-08
-6.50E-08
PASS
6.50E-08
PASS
-7.44E-09
1.37E-08
3.01E-08
-4.50E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
418
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=5V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.206. Plot of Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
419
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.206. Raw data for Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=5V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.29E-08
-2.24E-08
-1.49E-09
7.02E-09
6.15E-09
5.23E-09
1.38E-08
-4.28E-09
1.25E-09
-5.47E-09
-4.01E-10
10
1.31E-08
-2.11E-08
-6.41E-10
7.45E-09
6.99E-09
9.92E-09
1.48E-08
-3.20E-09
-3.92E-10
-5.45E-09
-3.93E-10
20
1.29E-08
-2.14E-08
-1.15E-09
6.86E-09
5.77E-09
9.51E-09
1.53E-08
-3.73E-09
-8.22E-10
-5.15E-09
-4.98E-10
30
1.21E-08
-2.20E-08
1.80E-11
6.09E-09
5.30E-09
8.98E-09
1.55E-08
-2.64E-09
-3.03E-09
-4.28E-09
-4.09E-10
50
1.61E-08
-1.39E-08
3.20E-10
5.97E-09
6.01E-09
8.89E-09
1.54E-08
-4.81E-09
-3.40E-09
-4.50E-09
-4.05E-10
60
1.65E-08
-1.39E-08
4.00E-12
5.60E-09
5.15E-09
8.72E-09
1.60E-08
-3.87E-09
-2.76E-09
-3.41E-09
-3.85E-10
70
1.37E-08
-2.09E-08
-1.37E-10
5.83E-09
5.57E-09
7.56E-09
1.41E-08
-3.60E-09
-2.21E-09
-5.58E-09
-4.75E-10
4.28E-10
1.38E-08
3.82E-08
-3.73E-08
1.17E-09
1.34E-08
3.79E-08
-3.55E-08
5.88E-10
1.33E-08
3.69E-08
-3.58E-08
3.01E-10
1.32E-08
3.65E-08
-3.59E-08
2.90E-09
1.09E-08
3.29E-08
-2.71E-08
2.68E-09
1.10E-08
3.29E-08
-2.76E-08
8.14E-10
1.31E-08
3.67E-08
-3.51E-08
2.10E-09
7.82E-09
2.35E-08
-1.93E-08
-6.50E-08
PASS
6.50E-08
PASS
3.14E-09
8.80E-09
2.73E-08
-2.10E-08
-6.50E-08
PASS
6.50E-08
PASS
3.02E-09
8.93E-09
2.75E-08
-2.15E-08
-6.50E-08
PASS
6.50E-08
PASS
2.91E-09
8.86E-09
2.72E-08
-2.14E-08
-6.50E-08
PASS
6.50E-08
PASS
2.32E-09
9.28E-09
2.78E-08
-2.31E-08
-6.50E-08
PASS
6.50E-08
PASS
2.93E-09
8.98E-09
2.76E-08
-2.17E-08
-6.50E-08
PASS
6.50E-08
PASS
2.05E-09
8.42E-09
2.51E-08
-2.10E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
420
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=5V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.207. Plot of Input Offset Current @ 5V, VCM=5V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
421
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.207. Raw data for Input Offset Current @ 5V, VCM=5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=5V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.07E-08
-1.85E-08
-1.67E-08
1.30E-08
-3.62E-09
-5.12E-10
3.16E-09
-8.83E-10
-7.03E-10
6.58E-10
-2.42E-09
10
1.18E-08
-1.85E-08
-1.58E-08
1.18E-08
-4.51E-09
-4.88E-10
3.27E-09
1.08E-09
-8.80E-11
8.22E-10
-2.39E-09
20
1.21E-08
-1.87E-08
-1.60E-08
1.07E-08
-5.39E-09
-3.28E-10
3.46E-09
-5.60E-11
4.65E-10
1.70E-10
-2.36E-09
30
1.06E-08
-1.74E-08
-1.55E-08
1.09E-08
-4.18E-09
-1.14E-10
4.81E-09
2.30E-09
8.03E-10
2.30E-10
-2.47E-09
50
1.07E-08
-1.82E-08
-1.66E-08
1.09E-08
-4.50E-09
2.81E-10
3.43E-09
1.05E-09
4.43E-10
-2.42E-10
-2.34E-09
60
1.10E-08
-1.80E-08
-1.65E-08
1.12E-08
-4.75E-09
1.00E-09
3.30E-09
1.07E-09
1.43E-09
2.01E-10
-2.41E-09
70
1.04E-08
-1.75E-08
-1.54E-08
1.16E-08
-4.06E-09
-3.43E-10
2.14E-09
1.91E-10
-4.70E-10
-1.36E-09
-2.39E-09
-3.03E-09
1.47E-08
3.74E-08
-4.34E-08
-3.04E-09
1.45E-08
3.67E-08
-4.28E-08
-3.45E-09
1.44E-08
3.61E-08
-4.30E-08
-3.10E-09
1.36E-08
3.42E-08
-4.04E-08
-3.53E-09
1.41E-08
3.52E-08
-4.23E-08
-3.42E-09
1.42E-08
3.55E-08
-4.24E-08
-2.98E-09
1.38E-08
3.48E-08
-4.08E-08
3.44E-10
1.69E-09
4.97E-09
-4.28E-09
-6.50E-08
PASS
6.50E-08
PASS
9.20E-10
1.46E-09
4.93E-09
-3.09E-09
-6.50E-08
PASS
6.50E-08
PASS
7.41E-10
1.55E-09
4.98E-09
-3.50E-09
-6.50E-08
PASS
6.50E-08
PASS
1.61E-09
2.02E-09
7.14E-09
-3.92E-09
-6.50E-08
PASS
6.50E-08
PASS
9.92E-10
1.44E-09
4.93E-09
-2.95E-09
-6.50E-08
PASS
6.50E-08
PASS
1.40E-09
1.15E-09
4.56E-09
-1.76E-09
-6.50E-08
PASS
6.50E-08
PASS
3.06E-11
1.30E-09
3.60E-09
-3.54E-09
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
422
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ 5V, VCM=5V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
8.00E-08
6.00E-08
4.00E-08
2.00E-08
0.00E+00
-2.00E-08
-4.00E-08
-6.00E-08
-8.00E-08
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.208. Plot of Input Offset Current @ 5V, VCM=5V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
423
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.208. Raw data for Input Offset Current @ 5V, VCM=5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Input Offset Current @ 5V, VCM=5V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.22E-08
-1.49E-09
-6.38E-09
-1.21E-08
6.83E-09
-8.71E-09
2.39E-09
1.36E-08
1.64E-09
-8.92E-09
-5.64E-09
10
1.18E-08
-4.68E-10
-5.95E-09
-1.26E-08
6.88E-09
-8.39E-09
2.13E-09
1.44E-08
5.13E-10
-7.64E-09
-5.52E-09
20
1.15E-08
-4.67E-10
-6.44E-09
-1.24E-08
6.47E-09
-7.52E-09
1.82E-09
1.32E-08
1.17E-09
-7.47E-09
-5.41E-09
30
1.10E-08
-9.39E-10
-5.70E-09
-1.21E-08
6.13E-09
-7.90E-09
2.17E-09
1.28E-08
5.75E-10
-7.57E-09
-5.50E-09
50
1.15E-08
-1.32E-09
-5.81E-09
-1.20E-08
6.82E-09
-8.44E-09
1.32E-09
1.21E-08
1.89E-09
-9.34E-09
-5.32E-09
60
1.15E-08
-1.04E-09
-5.16E-09
-1.24E-08
6.91E-09
-7.55E-09
1.52E-09
1.17E-08
1.73E-09
-8.29E-09
-5.39E-09
70
1.14E-08
-7.69E-10
-4.94E-09
-1.20E-08
6.37E-09
-8.26E-09
1.58E-09
1.37E-08
1.85E-09
-8.48E-09
-5.42E-09
-1.91E-10
9.79E-09
2.66E-08
-2.70E-08
-7.14E-11
9.78E-09
2.68E-08
-2.69E-08
-2.70E-10
9.63E-09
2.61E-08
-2.67E-08
-3.19E-10
9.17E-09
2.48E-08
-2.55E-08
-1.55E-10
9.46E-09
2.58E-08
-2.61E-08
-3.60E-11
9.50E-09
2.60E-08
-2.61E-08
4.80E-12
9.23E-09
2.53E-08
-2.53E-08
-5.80E-12
9.33E-09
2.56E-08
-2.56E-08
-6.50E-08
PASS
6.50E-08
PASS
2.11E-10
9.24E-09
2.56E-08
-2.51E-08
-6.50E-08
PASS
6.50E-08
PASS
2.37E-10
8.53E-09
2.36E-08
-2.31E-08
-6.50E-08
PASS
6.50E-08
PASS
1.46E-11
8.49E-09
2.33E-08
-2.33E-08
-6.50E-08
PASS
6.50E-08
PASS
-4.92E-10
8.80E-09
2.36E-08
-2.46E-08
-6.50E-08
PASS
6.50E-08
PASS
-1.70E-10
8.20E-09
2.23E-08
-2.27E-08
-6.50E-08
PASS
6.50E-08
PASS
7.72E-11
9.13E-09
2.51E-08
-2.50E-08
-6.50E-08
PASS
6.50E-08
PASS
An ISO 9001:2000 Certified Company
424
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=5V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.209. Plot of Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
425
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.209. Raw data for Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=5V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.73E-07
3.86E-07
3.82E-07
4.03E-07
4.21E-07
4.43E-07
4.04E-07
3.85E-07
4.15E-07
3.94E-07
4.43E-07
10
5.08E-07
4.06E-07
3.99E-07
4.21E-07
4.45E-07
4.86E-07
4.53E-07
4.25E-07
4.60E-07
4.34E-07
4.45E-07
20
5.27E-07
4.15E-07
4.08E-07
4.29E-07
4.57E-07
5.09E-07
4.78E-07
4.51E-07
4.88E-07
4.60E-07
4.44E-07
30
5.43E-07
4.24E-07
4.17E-07
4.36E-07
4.61E-07
5.28E-07
4.98E-07
4.67E-07
5.07E-07
4.76E-07
4.43E-07
50
5.69E-07
4.41E-07
4.31E-07
4.48E-07
4.73E-07
5.59E-07
5.30E-07
4.98E-07
5.38E-07
5.07E-07
4.44E-07
60
5.67E-07
4.37E-07
4.32E-07
4.48E-07
4.73E-07
5.56E-07
5.26E-07
4.93E-07
5.37E-07
5.02E-07
4.44E-07
70
5.30E-07
4.21E-07
4.15E-07
4.35E-07
4.56E-07
5.13E-07
4.82E-07
4.57E-07
4.90E-07
4.65E-07
4.45E-07
4.13E-07
3.71E-08
5.15E-07
3.11E-07
4.36E-07
4.41E-08
5.57E-07
3.15E-07
4.47E-07
4.85E-08
5.80E-07
3.14E-07
4.56E-07
5.14E-08
5.97E-07
3.15E-07
4.72E-07
5.62E-08
6.27E-07
3.18E-07
4.71E-07
5.54E-08
6.23E-07
3.19E-07
4.51E-07
4.69E-08
5.80E-07
3.23E-07
4.08E-07
2.25E-08
4.70E-07
3.46E-07
-6.50E-07
PASS
6.50E-07
PASS
4.52E-07
2.37E-08
5.17E-07
3.87E-07
-7.00E-07
PASS
7.00E-07
PASS
4.77E-07
2.30E-08
5.40E-07
4.14E-07
-7.50E-07
PASS
7.50E-07
PASS
4.95E-07
2.45E-08
5.63E-07
4.28E-07
-7.50E-07
PASS
7.50E-07
PASS
5.27E-07
2.45E-08
5.94E-07
4.59E-07
-8.00E-07
PASS
8.00E-07
PASS
5.23E-07
2.56E-08
5.93E-07
4.52E-07
-8.00E-07
PASS
8.00E-07
PASS
4.82E-07
2.21E-08
5.42E-07
4.21E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
426
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=5V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.210. Plot of Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
427
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.210. Raw data for Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=5V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.49E-07
4.38E-07
4.14E-07
4.42E-07
4.66E-07
3.53E-07
4.29E-07
4.43E-07
4.16E-07
3.90E-07
3.90E-07
10
4.81E-07
4.58E-07
4.35E-07
4.63E-07
4.87E-07
3.94E-07
4.71E-07
4.88E-07
4.69E-07
4.35E-07
3.93E-07
20
5.00E-07
4.70E-07
4.45E-07
4.72E-07
4.97E-07
4.17E-07
4.94E-07
5.13E-07
4.95E-07
4.60E-07
3.90E-07
30
5.14E-07
4.81E-07
4.53E-07
4.80E-07
5.04E-07
4.32E-07
5.11E-07
5.33E-07
5.10E-07
4.83E-07
3.91E-07
50
5.38E-07
4.98E-07
4.69E-07
4.96E-07
5.20E-07
4.61E-07
5.42E-07
5.64E-07
5.45E-07
5.13E-07
3.86E-07
60
5.36E-07
4.97E-07
4.67E-07
4.95E-07
5.20E-07
4.57E-07
5.39E-07
5.61E-07
5.46E-07
5.09E-07
3.92E-07
70
5.02E-07
4.77E-07
4.52E-07
4.76E-07
5.02E-07
4.22E-07
4.96E-07
5.22E-07
5.00E-07
4.67E-07
3.94E-07
4.42E-07
1.88E-08
4.93E-07
3.90E-07
4.65E-07
2.06E-08
5.21E-07
4.08E-07
4.77E-07
2.26E-08
5.39E-07
4.15E-07
4.86E-07
2.37E-08
5.51E-07
4.21E-07
5.04E-07
2.64E-08
5.77E-07
4.32E-07
5.03E-07
2.60E-08
5.75E-07
4.32E-07
4.82E-07
2.09E-08
5.39E-07
4.24E-07
4.06E-07
3.55E-08
5.04E-07
3.09E-07
-6.50E-07
PASS
6.50E-07
PASS
4.51E-07
3.72E-08
5.53E-07
3.49E-07
-7.00E-07
PASS
7.00E-07
PASS
4.76E-07
3.79E-08
5.80E-07
3.72E-07
-7.50E-07
PASS
7.50E-07
PASS
4.94E-07
3.89E-08
6.00E-07
3.87E-07
-7.50E-07
PASS
7.50E-07
PASS
5.25E-07
4.01E-08
6.35E-07
4.15E-07
-8.00E-07
PASS
8.00E-07
PASS
5.22E-07
4.13E-08
6.35E-07
4.09E-07
-8.00E-07
PASS
8.00E-07
PASS
4.81E-07
3.87E-08
5.87E-07
3.75E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
428
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=5V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.211. Plot of Positive Input Bias Current @ 5V, VCM=5V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
429
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.211. Raw data for Positive Input Bias Current @ 5V, VCM=5V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=5V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.42E-07
4.39E-07
4.11E-07
4.47E-07
4.46E-07
3.55E-07
4.18E-07
4.51E-07
4.17E-07
3.90E-07
3.86E-07
10
4.73E-07
4.62E-07
4.28E-07
4.70E-07
4.68E-07
3.95E-07
4.55E-07
4.97E-07
4.65E-07
4.35E-07
3.86E-07
20
4.91E-07
4.75E-07
4.39E-07
4.82E-07
4.80E-07
4.18E-07
4.78E-07
5.23E-07
4.93E-07
4.62E-07
3.87E-07
30
5.04E-07
4.84E-07
4.47E-07
4.88E-07
4.89E-07
4.35E-07
4.98E-07
5.43E-07
5.12E-07
4.80E-07
3.85E-07
50
5.26E-07
5.00E-07
4.61E-07
5.05E-07
5.04E-07
4.64E-07
5.28E-07
5.74E-07
5.45E-07
5.13E-07
3.85E-07
60
5.24E-07
4.99E-07
4.61E-07
5.07E-07
5.03E-07
4.60E-07
5.24E-07
5.70E-07
5.41E-07
5.09E-07
3.86E-07
70
4.92E-07
4.79E-07
4.45E-07
4.84E-07
4.86E-07
4.24E-07
4.81E-07
5.29E-07
4.96E-07
4.66E-07
3.88E-07
4.37E-07
1.50E-08
4.78E-07
3.96E-07
4.60E-07
1.83E-08
5.11E-07
4.10E-07
4.73E-07
1.98E-08
5.28E-07
4.19E-07
4.83E-07
2.11E-08
5.41E-07
4.25E-07
4.99E-07
2.39E-08
5.65E-07
4.34E-07
4.99E-07
2.33E-08
5.63E-07
4.35E-07
4.77E-07
1.86E-08
5.28E-07
4.26E-07
4.06E-07
3.59E-08
5.05E-07
3.08E-07
-6.50E-07
PASS
6.50E-07
PASS
4.50E-07
3.80E-08
5.54E-07
3.45E-07
-7.00E-07
PASS
7.00E-07
PASS
4.75E-07
3.90E-08
5.82E-07
3.68E-07
-7.50E-07
PASS
7.50E-07
PASS
4.93E-07
4.00E-08
6.03E-07
3.84E-07
-7.50E-07
PASS
7.50E-07
PASS
5.25E-07
4.07E-08
6.37E-07
4.13E-07
-8.00E-07
PASS
8.00E-07
PASS
5.21E-07
4.10E-08
6.33E-07
4.08E-07
-8.00E-07
PASS
8.00E-07
PASS
4.79E-07
3.86E-08
5.85E-07
3.73E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
430
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Positive Input Bias Current @ 5V, VCM=5V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.212. Plot of Positive Input Bias Current @ 5V, VCM=5V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
431
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.212. Raw data for Positive Input Bias Current @ 5V, VCM=5V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Input Bias Current @ 5V, VCM=5V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.80E-07
3.79E-07
3.75E-07
4.10E-07
4.30E-07
4.36E-07
4.12E-07
3.96E-07
4.12E-07
3.79E-07
4.43E-07
10
5.12E-07
3.99E-07
3.91E-07
4.25E-07
4.47E-07
4.79E-07
4.57E-07
4.39E-07
4.55E-07
4.17E-07
4.43E-07
20
5.30E-07
4.13E-07
4.00E-07
4.35E-07
4.55E-07
5.04E-07
4.83E-07
4.62E-07
4.81E-07
4.40E-07
4.45E-07
30
5.44E-07
4.21E-07
4.12E-07
4.41E-07
4.61E-07
5.20E-07
5.01E-07
4.80E-07
5.01E-07
4.56E-07
4.43E-07
50
5.69E-07
4.38E-07
4.24E-07
4.54E-07
4.75E-07
5.51E-07
5.35E-07
5.10E-07
5.34E-07
4.85E-07
4.43E-07
60
5.65E-07
4.37E-07
4.23E-07
4.53E-07
4.74E-07
5.49E-07
5.31E-07
5.06E-07
5.28E-07
4.81E-07
4.42E-07
70
5.33E-07
4.16E-07
4.06E-07
4.39E-07
4.59E-07
5.06E-07
4.86E-07
4.70E-07
4.87E-07
4.47E-07
4.45E-07
4.15E-07
4.29E-08
5.32E-07
2.97E-07
4.35E-07
4.85E-08
5.68E-07
3.02E-07
4.46E-07
5.14E-08
5.87E-07
3.05E-07
4.56E-07
5.30E-08
6.01E-07
3.10E-07
4.72E-07
5.76E-08
6.30E-07
3.14E-07
4.70E-07
5.60E-08
6.24E-07
3.17E-07
4.51E-07
5.06E-08
5.90E-07
3.12E-07
4.07E-07
2.14E-08
4.66E-07
3.48E-07
-6.50E-07
PASS
6.50E-07
PASS
4.50E-07
2.33E-08
5.13E-07
3.86E-07
-7.00E-07
PASS
7.00E-07
PASS
4.74E-07
2.42E-08
5.40E-07
4.07E-07
-7.50E-07
PASS
7.50E-07
PASS
4.92E-07
2.43E-08
5.58E-07
4.25E-07
-7.50E-07
PASS
7.50E-07
PASS
5.23E-07
2.57E-08
5.94E-07
4.53E-07
-8.00E-07
PASS
8.00E-07
PASS
5.19E-07
2.62E-08
5.91E-07
4.47E-07
-8.00E-07
PASS
8.00E-07
PASS
4.79E-07
2.21E-08
5.40E-07
4.18E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
432
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=5V #1 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.213. Plot of Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
433
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.213. Raw data for Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=5V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.69E-07
3.73E-07
3.71E-07
4.09E-07
4.14E-07
4.53E-07
4.31E-07
3.85E-07
4.16E-07
3.84E-07
4.48E-07
10
5.02E-07
3.94E-07
3.89E-07
4.25E-07
4.33E-07
4.94E-07
4.80E-07
4.26E-07
4.63E-07
4.25E-07
4.49E-07
20
5.21E-07
4.06E-07
4.02E-07
4.34E-07
4.43E-07
5.19E-07
5.06E-07
4.51E-07
4.90E-07
4.47E-07
4.50E-07
30
5.36E-07
4.15E-07
4.08E-07
4.40E-07
4.51E-07
5.35E-07
5.25E-07
4.68E-07
5.10E-07
4.66E-07
4.47E-07
50
5.62E-07
4.33E-07
4.25E-07
4.54E-07
4.64E-07
5.68E-07
5.57E-07
4.99E-07
5.43E-07
4.96E-07
4.48E-07
60
5.58E-07
4.31E-07
4.25E-07
4.53E-07
4.62E-07
5.64E-07
5.54E-07
4.95E-07
5.38E-07
4.92E-07
4.48E-07
70
5.25E-07
4.11E-07
4.07E-07
4.40E-07
4.47E-07
5.24E-07
5.11E-07
4.59E-07
4.93E-07
4.56E-07
4.51E-07
4.07E-07
3.99E-08
5.17E-07
2.98E-07
4.29E-07
4.53E-08
5.53E-07
3.04E-07
4.41E-07
4.79E-08
5.73E-07
3.10E-07
4.50E-07
5.13E-08
5.91E-07
3.10E-07
4.68E-07
5.50E-08
6.18E-07
3.17E-07
4.66E-07
5.38E-08
6.13E-07
3.18E-07
4.46E-07
4.76E-08
5.77E-07
3.16E-07
4.14E-07
2.97E-08
4.95E-07
3.33E-07
-6.50E-07
PASS
6.50E-07
PASS
4.58E-07
3.12E-08
5.43E-07
3.72E-07
-7.00E-07
PASS
7.00E-07
PASS
4.83E-07
3.20E-08
5.71E-07
3.95E-07
-7.50E-07
PASS
7.50E-07
PASS
5.01E-07
3.22E-08
5.89E-07
4.13E-07
-7.50E-07
PASS
7.50E-07
PASS
5.33E-07
3.32E-08
6.24E-07
4.42E-07
-8.00E-07
PASS
8.00E-07
PASS
5.29E-07
3.32E-08
6.20E-07
4.38E-07
-8.00E-07
PASS
8.00E-07
PASS
4.89E-07
3.03E-08
5.72E-07
4.05E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
434
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=5V #2 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.214. Plot of Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
435
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.214. Raw data for Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=5V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.35E-07
4.57E-07
4.16E-07
4.35E-07
4.58E-07
3.46E-07
4.15E-07
4.46E-07
4.13E-07
3.98E-07
3.86E-07
10
4.66E-07
4.80E-07
4.34E-07
4.54E-07
4.79E-07
3.84E-07
4.55E-07
4.91E-07
4.68E-07
4.38E-07
3.88E-07
20
4.86E-07
4.91E-07
4.45E-07
4.66E-07
4.90E-07
4.07E-07
4.77E-07
5.16E-07
4.96E-07
4.66E-07
3.92E-07
30
4.97E-07
5.02E-07
4.53E-07
4.73E-07
4.97E-07
4.23E-07
4.96E-07
5.35E-07
5.20E-07
4.84E-07
3.89E-07
50
5.22E-07
5.13E-07
4.69E-07
4.89E-07
5.13E-07
4.51E-07
5.24E-07
5.70E-07
5.44E-07
5.15E-07
3.89E-07
60
5.19E-07
5.12E-07
4.68E-07
4.88E-07
5.15E-07
4.49E-07
5.22E-07
5.65E-07
5.40E-07
5.11E-07
3.92E-07
70
4.88E-07
4.96E-07
4.51E-07
4.70E-07
4.96E-07
4.14E-07
4.81E-07
5.25E-07
4.96E-07
4.70E-07
3.92E-07
4.40E-07
1.77E-08
4.89E-07
3.92E-07
4.63E-07
1.91E-08
5.15E-07
4.10E-07
4.76E-07
2.00E-08
5.31E-07
4.21E-07
4.84E-07
2.10E-08
5.42E-07
4.27E-07
5.01E-07
2.20E-08
5.61E-07
4.41E-07
5.00E-07
2.17E-08
5.60E-07
4.41E-07
4.80E-07
1.92E-08
5.33E-07
4.27E-07
4.04E-07
3.65E-08
5.04E-07
3.04E-07
-6.50E-07
PASS
6.50E-07
PASS
4.47E-07
4.02E-08
5.57E-07
3.37E-07
-7.00E-07
PASS
7.00E-07
PASS
4.72E-07
4.10E-08
5.85E-07
3.60E-07
-7.50E-07
PASS
7.50E-07
PASS
4.91E-07
4.32E-08
6.10E-07
3.73E-07
-7.50E-07
PASS
7.50E-07
PASS
5.21E-07
4.43E-08
6.42E-07
3.99E-07
-8.00E-07
PASS
8.00E-07
PASS
5.17E-07
4.36E-08
6.37E-07
3.98E-07
-8.00E-07
PASS
8.00E-07
PASS
4.77E-07
4.08E-08
5.89E-07
3.66E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
436
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=5V #3 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.215. Plot of Negative Input Bias Current @ 5V, VCM=5V #3 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
437
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.215. Raw data for Negative Input Bias Current @ 5V, VCM=5V #3 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=5V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.30E-07
4.57E-07
4.27E-07
4.35E-07
4.49E-07
3.57E-07
4.11E-07
4.51E-07
4.19E-07
3.91E-07
3.88E-07
10
4.60E-07
4.80E-07
4.44E-07
4.58E-07
4.71E-07
3.95E-07
4.52E-07
4.96E-07
4.65E-07
4.35E-07
3.88E-07
20
4.77E-07
4.92E-07
4.54E-07
4.68E-07
4.84E-07
4.17E-07
4.74E-07
5.22E-07
4.91E-07
4.61E-07
3.89E-07
30
4.92E-07
5.01E-07
4.61E-07
4.76E-07
4.91E-07
4.34E-07
4.91E-07
5.40E-07
5.11E-07
4.80E-07
3.87E-07
50
5.16E-07
5.18E-07
4.78E-07
4.94E-07
5.08E-07
4.61E-07
5.25E-07
5.73E-07
5.43E-07
5.12E-07
3.89E-07
60
5.12E-07
5.16E-07
4.77E-07
4.93E-07
5.07E-07
4.58E-07
5.21E-07
5.69E-07
5.38E-07
5.07E-07
3.87E-07
70
4.82E-07
4.95E-07
4.61E-07
4.72E-07
4.88E-07
4.24E-07
4.80E-07
5.28E-07
4.96E-07
4.69E-07
3.90E-07
4.40E-07
1.29E-08
4.75E-07
4.04E-07
4.63E-07
1.37E-08
5.00E-07
4.25E-07
4.75E-07
1.47E-08
5.16E-07
4.35E-07
4.84E-07
1.60E-08
5.28E-07
4.40E-07
5.03E-07
1.69E-08
5.49E-07
4.57E-07
5.01E-07
1.62E-08
5.45E-07
4.57E-07
4.79E-07
1.35E-08
5.16E-07
4.42E-07
4.06E-07
3.46E-08
5.00E-07
3.11E-07
-6.50E-07
PASS
6.50E-07
PASS
4.49E-07
3.76E-08
5.52E-07
3.45E-07
-7.00E-07
PASS
7.00E-07
PASS
4.73E-07
3.87E-08
5.79E-07
3.67E-07
-7.50E-07
PASS
7.50E-07
PASS
4.91E-07
3.95E-08
5.99E-07
3.83E-07
-7.50E-07
PASS
7.50E-07
PASS
5.23E-07
4.13E-08
6.36E-07
4.10E-07
-8.00E-07
PASS
8.00E-07
PASS
5.19E-07
4.09E-08
6.31E-07
4.07E-07
-8.00E-07
PASS
8.00E-07
PASS
4.79E-07
3.80E-08
5.84E-07
3.75E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
438
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Negative Input Bias Current @ 5V, VCM=5V #4 (A)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.00E-06
8.00E-07
6.00E-07
4.00E-07
2.00E-07
0.00E+00
-2.00E-07
-4.00E-07
-6.00E-07
-8.00E-07
-1.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.216. Plot of Negative Input Bias Current @ 5V, VCM=5V #4 (A) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
439
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.216. Raw data for Negative Input Bias Current @ 5V, VCM=5V #4 (A) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Input Bias Current @ 5V, VCM=5V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.68E-07
3.77E-07
3.77E-07
4.20E-07
4.22E-07
4.43E-07
4.08E-07
3.84E-07
4.09E-07
3.85E-07
4.46E-07
10
4.99E-07
3.99E-07
3.95E-07
4.34E-07
4.40E-07
4.85E-07
4.56E-07
4.23E-07
4.54E-07
4.24E-07
4.48E-07
20
5.17E-07
4.12E-07
4.06E-07
4.46E-07
4.48E-07
5.10E-07
4.81E-07
4.49E-07
4.81E-07
4.47E-07
4.47E-07
30
5.32E-07
4.21E-07
4.12E-07
4.52E-07
4.54E-07
5.29E-07
5.00E-07
4.66E-07
5.00E-07
4.65E-07
4.46E-07
50
5.56E-07
4.38E-07
4.28E-07
4.65E-07
4.68E-07
5.60E-07
5.31E-07
4.98E-07
5.32E-07
4.94E-07
4.48E-07
60
5.54E-07
4.36E-07
4.27E-07
4.65E-07
4.66E-07
5.57E-07
5.29E-07
4.94E-07
5.28E-07
4.90E-07
4.47E-07
70
5.24E-07
4.16E-07
4.11E-07
4.50E-07
4.53E-07
5.15E-07
4.85E-07
4.56E-07
4.85E-07
4.55E-07
4.48E-07
4.13E-07
3.78E-08
5.16E-07
3.09E-07
4.33E-07
4.17E-08
5.48E-07
3.19E-07
4.46E-07
4.42E-08
5.67E-07
3.24E-07
4.54E-07
4.74E-08
5.84E-07
3.24E-07
4.71E-07
5.07E-08
6.10E-07
3.32E-07
4.70E-07
5.00E-08
6.07E-07
3.33E-07
4.51E-07
4.50E-08
5.74E-07
3.27E-07
4.06E-07
2.41E-08
4.72E-07
3.40E-07
-6.50E-07
PASS
6.50E-07
PASS
4.48E-07
2.55E-08
5.18E-07
3.78E-07
-7.00E-07
PASS
7.00E-07
PASS
4.73E-07
2.62E-08
5.45E-07
4.02E-07
-7.50E-07
PASS
7.50E-07
PASS
4.92E-07
2.69E-08
5.66E-07
4.18E-07
-7.50E-07
PASS
7.50E-07
PASS
5.23E-07
2.71E-08
5.97E-07
4.49E-07
-8.00E-07
PASS
8.00E-07
PASS
5.20E-07
2.76E-08
5.96E-07
4.44E-07
-8.00E-07
PASS
8.00E-07
PASS
4.79E-07
2.49E-08
5.47E-07
4.11E-07
-8.00E-07
PASS
8.00E-07
PASS
An ISO 9001:2000 Certified Company
440
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #1 (V/mV)
3.00E+03
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.217. Plot of Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
441
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.217. Raw data for Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #1 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.93E+03
2.54E+03
3.13E+03
2.03E+03
2.82E+03
1.43E+03
1.92E+03
2.58E+03
1.93E+03
2.50E+03
2.45E+03
10
1.78E+03
1.88E+03
2.68E+03
1.95E+03
2.40E+03
2.27E+03
1.74E+03
2.35E+03
2.09E+03
2.89E+03
2.73E+03
20
1.73E+03
1.86E+03
2.57E+03
1.85E+03
2.28E+03
2.81E+03
2.06E+03
2.44E+03
2.01E+03
2.63E+03
2.45E+03
30
1.69E+03
1.91E+03
2.27E+03
1.74E+03
2.21E+03
2.17E+03
1.79E+03
2.22E+03
1.77E+03
2.29E+03
2.63E+03
50
1.48E+03
1.86E+03
1.98E+03
2.35E+03
2.38E+03
2.47E+03
1.65E+03
2.54E+03
1.74E+03
2.29E+03
2.72E+03
60
1.84E+03
2.22E+03
2.89E+03
1.92E+03
2.54E+03
2.21E+03
1.74E+03
2.36E+03
1.98E+03
2.94E+03
2.74E+03
70
1.63E+03
2.47E+03
2.80E+03
1.57E+03
2.53E+03
2.34E+03
1.83E+03
2.23E+03
1.86E+03
2.52E+03
2.62E+03
2.49E+03
5.13E+02
3.89E+03
1.08E+03
2.13E+03
3.84E+02
3.19E+03
1.08E+03
2.06E+03
3.54E+02
3.03E+03
1.09E+03
1.97E+03
2.65E+02
2.69E+03
1.24E+03
2.01E+03
3.73E+02
3.04E+03
9.90E+02
2.28E+03
4.40E+02
3.49E+03
1.08E+03
2.20E+03
5.62E+02
3.74E+03
6.60E+02
2.07E+03
4.75E+02
3.37E+03
7.69E+02
6.00E+02
PASS
2.27E+03
4.17E+02
3.41E+03
1.12E+03
3.00E+02
PASS
2.39E+03
3.50E+02
3.35E+03
1.43E+03
3.00E+02
PASS
2.05E+03
2.48E+02
2.73E+03
1.37E+03
3.00E+02
PASS
2.14E+03
4.16E+02
3.28E+03
1.00E+03
3.00E+02
PASS
2.25E+03
4.50E+02
3.48E+03
1.01E+03
3.00E+02
PASS
2.15E+03
3.05E+02
2.99E+03
1.32E+03
3.00E+02
PASS
An ISO 9001:2000 Certified Company
442
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #2 (V/mV)
3.00E+03
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.218. Plot of Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
443
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.218. Raw data for Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #2 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
2.24E+03
1.88E+03
2.19E+03
1.83E+03
1.97E+03
2.37E+03
3.67E+03
2.44E+03
2.69E+03
2.14E+03
3.23E+03
10
1.95E+03
1.76E+03
1.79E+03
2.73E+03
1.86E+03
1.80E+03
2.36E+03
2.55E+03
2.73E+03
2.23E+03
2.52E+03
20
1.69E+03
1.88E+03
1.77E+03
1.88E+03
2.11E+03
2.20E+03
2.57E+03
2.48E+03
2.65E+03
2.12E+03
2.31E+03
30
1.97E+03
1.96E+03
1.97E+03
2.62E+03
1.74E+03
2.22E+03
2.00E+03
3.31E+03
2.54E+03
2.02E+03
2.87E+03
50
1.91E+03
1.94E+03
1.94E+03
1.99E+03
2.52E+03
2.00E+03
1.90E+03
2.69E+03
2.18E+03
1.34E+03
2.95E+03
60
1.68E+03
1.71E+03
1.72E+03
1.91E+03
2.10E+03
1.97E+03
3.10E+03
2.33E+03
2.37E+03
2.09E+03
2.80E+03
70
2.42E+03
1.81E+03
1.75E+03
1.80E+03
1.80E+03
1.57E+03
2.29E+03
1.89E+03
2.08E+03
2.07E+03
2.68E+03
2.02E+03
1.84E+02
2.52E+03
1.52E+03
2.02E+03
4.03E+02
3.12E+03
9.13E+02
1.87E+03
1.57E+02
2.30E+03
1.44E+03
2.05E+03
3.31E+02
2.96E+03
1.15E+03
2.06E+03
2.60E+02
2.77E+03
1.35E+03
1.82E+03
1.78E+02
2.31E+03
1.34E+03
1.91E+03
2.82E+02
2.69E+03
1.14E+03
2.66E+03
5.96E+02
4.30E+03
1.03E+03
6.00E+02
PASS
2.33E+03
3.55E+02
3.31E+03
1.36E+03
3.00E+02
PASS
2.40E+03
2.34E+02
3.05E+03
1.76E+03
3.00E+02
PASS
2.42E+03
5.43E+02
3.91E+03
9.28E+02
3.00E+02
PASS
2.02E+03
4.85E+02
3.35E+03
6.89E+02
3.00E+02
PASS
2.37E+03
4.38E+02
3.57E+03
1.17E+03
3.00E+02
PASS
1.98E+03
2.71E+02
2.72E+03
1.24E+03
3.00E+02
PASS
An ISO 9001:2000 Certified Company
444
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #3 (V/mV)
3.00E+03
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.219. Plot of Large Signal Voltage Gain @ 5V #3 (V/mV) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
445
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.219. Raw data for Large Signal Voltage Gain @ 5V #3 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #3 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
2.85E+03
2.61E+03
2.35E+03
3.50E+03
2.27E+03
2.99E+03
2.12E+03
2.06E+03
2.16E+03
1.93E+03
2.14E+03
10
2.49E+03
2.72E+03
1.72E+03
2.19E+03
2.42E+03
2.87E+03
2.28E+03
2.07E+03
1.88E+03
1.99E+03
2.08E+03
20
2.29E+03
2.03E+03
1.75E+03
1.63E+03
2.72E+03
2.40E+03
2.30E+03
2.08E+03
2.05E+03
2.06E+03
1.94E+03
30
2.49E+03
2.25E+03
1.71E+03
2.04E+03
2.30E+03
2.28E+03
1.97E+03
2.43E+03
1.98E+03
1.76E+03
2.01E+03
50
2.21E+03
2.12E+03
1.84E+03
1.45E+03
2.27E+03
2.64E+03
1.93E+03
1.96E+03
1.86E+03
1.60E+03
2.01E+03
60
2.10E+03
1.98E+03
1.86E+03
1.88E+03
1.79E+03
2.61E+03
2.95E+03
2.17E+03
2.19E+03
2.10E+03
2.23E+03
70
2.52E+03
2.67E+03
1.71E+03
1.86E+03
2.26E+03
2.50E+03
2.31E+03
1.83E+03
2.17E+03
2.05E+03
1.94E+03
2.72E+03
4.93E+02
4.07E+03
1.36E+03
2.31E+03
3.78E+02
3.34E+03
1.27E+03
2.08E+03
4.36E+02
3.28E+03
8.88E+02
2.16E+03
2.94E+02
2.96E+03
1.35E+03
1.98E+03
3.39E+02
2.91E+03
1.05E+03
1.92E+03
1.21E+02
2.26E+03
1.59E+03
2.20E+03
4.14E+02
3.34E+03
1.07E+03
2.25E+03
4.23E+02
3.41E+03
1.09E+03
6.00E+02
PASS
2.22E+03
3.92E+02
3.29E+03
1.14E+03
3.00E+02
PASS
2.18E+03
1.60E+02
2.62E+03
1.74E+03
3.00E+02
PASS
2.08E+03
2.69E+02
2.82E+03
1.34E+03
3.00E+02
PASS
2.00E+03
3.83E+02
3.05E+03
9.46E+02
3.00E+02
PASS
2.40E+03
3.66E+02
3.41E+03
1.40E+03
3.00E+02
PASS
2.17E+03
2.57E+02
2.88E+03
1.47E+03
3.00E+02
PASS
An ISO 9001:2000 Certified Company
446
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #4 (V/mV)
2.50E+03
2.00E+03
1.50E+03
1.00E+03
5.00E+02
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.220. Plot of Large Signal Voltage Gain @ 5V #4 (V/mV) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
447
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.220. Raw data for Large Signal Voltage Gain @ 5V #4 (V/mV) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #4 (V/mV)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
2.36E+03
1.88E+03
2.83E+03
2.27E+03
2.21E+03
2.19E+03
2.05E+03
2.38E+03
2.06E+03
2.07E+03
2.80E+03
10
1.91E+03
1.96E+03
2.48E+03
2.13E+03
1.89E+03
1.89E+03
1.56E+03
2.13E+03
2.19E+03
1.99E+03
2.43E+03
20
1.96E+03
1.91E+03
2.45E+03
2.18E+03
1.65E+03
2.78E+03
1.74E+03
2.00E+03
1.94E+03
1.92E+03
2.77E+03
30
1.99E+03
1.75E+03
2.54E+03
2.42E+03
1.71E+03
1.87E+03
1.87E+03
2.08E+03
1.87E+03
2.00E+03
3.39E+03
50
1.97E+03
1.61E+03
2.33E+03
1.93E+03
1.74E+03
2.30E+03
1.86E+03
1.96E+03
1.53E+03
1.96E+03
2.46E+03
60
2.20E+03
1.76E+03
2.37E+03
2.06E+03
1.70E+03
1.55E+03
2.20E+03
2.05E+03
1.94E+03
1.71E+03
2.05E+03
70
1.92E+03
1.81E+03
2.26E+03
2.13E+03
1.81E+03
1.78E+03
1.75E+03
1.79E+03
1.96E+03
1.76E+03
2.67E+03
2.31E+03
3.43E+02
3.25E+03
1.37E+03
2.07E+03
2.48E+02
2.75E+03
1.39E+03
2.03E+03
2.99E+02
2.85E+03
1.21E+03
2.08E+03
3.84E+02
3.13E+03
1.03E+03
1.92E+03
2.73E+02
2.67E+03
1.17E+03
2.02E+03
2.86E+02
2.80E+03
1.24E+03
1.98E+03
2.01E+02
2.53E+03
1.43E+03
2.15E+03
1.39E+02
2.53E+03
1.77E+03
6.00E+02
PASS
1.95E+03
2.48E+02
2.63E+03
1.27E+03
3.00E+02
PASS
2.07E+03
4.05E+02
3.18E+03
9.63E+02
3.00E+02
PASS
1.94E+03
9.80E+01
2.21E+03
1.67E+03
3.00E+02
PASS
1.92E+03
2.74E+02
2.67E+03
1.17E+03
3.00E+02
PASS
1.89E+03
2.59E+02
2.60E+03
1.18E+03
3.00E+02
PASS
1.81E+03
8.50E+01
2.04E+03
1.57E+03
3.00E+02
PASS
An ISO 9001:2000 Certified Company
448
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #1 (dB)
1.30E+02
1.25E+02
1.20E+02
1.15E+02
1.10E+02
1.05E+02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.221. Plot of Large Signal Voltage Gain @ 5V #1 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
449
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.221. Raw data for Large Signal Voltage Gain @ 5V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.26E+02
1.28E+02
1.30E+02
1.26E+02
1.29E+02
1.23E+02
1.26E+02
1.28E+02
1.26E+02
1.28E+02
1.28E+02
10
1.25E+02
1.25E+02
1.29E+02
1.26E+02
1.28E+02
1.27E+02
1.25E+02
1.27E+02
1.26E+02
1.29E+02
1.29E+02
20
1.25E+02
1.25E+02
1.28E+02
1.25E+02
1.27E+02
1.29E+02
1.26E+02
1.28E+02
1.26E+02
1.28E+02
1.28E+02
30
1.25E+02
1.26E+02
1.27E+02
1.25E+02
1.27E+02
1.27E+02
1.25E+02
1.27E+02
1.25E+02
1.27E+02
1.28E+02
50
1.23E+02
1.25E+02
1.26E+02
1.27E+02
1.28E+02
1.28E+02
1.24E+02
1.28E+02
1.25E+02
1.27E+02
1.29E+02
60
1.25E+02
1.27E+02
1.29E+02
1.26E+02
1.28E+02
1.27E+02
1.25E+02
1.27E+02
1.26E+02
1.29E+02
1.29E+02
70
1.24E+02
1.28E+02
1.29E+02
1.24E+02
1.28E+02
1.27E+02
1.25E+02
1.27E+02
1.25E+02
1.28E+02
1.28E+02
1.28E+02
1.81E+00
1.33E+02
1.23E+02
1.26E+02
1.52E+00
1.31E+02
1.22E+02
1.26E+02
1.44E+00
1.30E+02
1.22E+02
1.26E+02
1.17E+00
1.29E+02
1.23E+02
1.26E+02
1.69E+00
1.31E+02
1.21E+02
1.27E+02
1.65E+00
1.32E+02
1.23E+02
1.27E+02
2.34E+00
1.33E+02
1.20E+02
1.26E+02
2.09E+00
1.32E+02
1.20E+02
1.16E+02
PASS
1.27E+02
1.59E+00
1.31E+02
1.23E+02
1.10E+02
PASS
1.27E+02
1.29E+00
1.31E+02
1.24E+02
1.10E+02
PASS
1.26E+02
1.08E+00
1.29E+02
1.23E+02
1.10E+02
PASS
1.26E+02
1.75E+00
1.31E+02
1.22E+02
1.10E+02
PASS
1.27E+02
1.70E+00
1.32E+02
1.22E+02
1.10E+02
PASS
1.27E+02
1.24E+00
1.30E+02
1.23E+02
1.10E+02
PASS
An ISO 9001:2000 Certified Company
450
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #2 (dB)
1.30E+02
1.25E+02
1.20E+02
1.15E+02
1.10E+02
1.05E+02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.222. Plot of Large Signal Voltage Gain @ 5V #2 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
451
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.222. Raw data for Large Signal Voltage Gain @ 5V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.27E+02
1.25E+02
1.27E+02
1.25E+02
1.26E+02
1.27E+02
1.31E+02
1.28E+02
1.29E+02
1.27E+02
1.30E+02
10
1.26E+02
1.25E+02
1.25E+02
1.29E+02
1.25E+02
1.25E+02
1.27E+02
1.28E+02
1.29E+02
1.27E+02
1.28E+02
20
1.25E+02
1.25E+02
1.25E+02
1.25E+02
1.26E+02
1.27E+02
1.28E+02
1.28E+02
1.28E+02
1.27E+02
1.27E+02
30
1.26E+02
1.26E+02
1.26E+02
1.28E+02
1.25E+02
1.27E+02
1.26E+02
1.30E+02
1.28E+02
1.26E+02
1.29E+02
50
1.26E+02
1.26E+02
1.26E+02
1.26E+02
1.28E+02
1.26E+02
1.26E+02
1.29E+02
1.27E+02
1.23E+02
1.29E+02
60
1.25E+02
1.25E+02
1.25E+02
1.26E+02
1.26E+02
1.26E+02
1.30E+02
1.27E+02
1.27E+02
1.26E+02
1.29E+02
70
1.28E+02
1.25E+02
1.25E+02
1.25E+02
1.25E+02
1.24E+02
1.27E+02
1.26E+02
1.26E+02
1.26E+02
1.29E+02
1.26E+02
7.86E-01
1.28E+02
1.24E+02
1.26E+02
1.57E+00
1.30E+02
1.22E+02
1.25E+02
7.18E-01
1.27E+02
1.23E+02
1.26E+02
1.31E+00
1.30E+02
1.23E+02
1.26E+02
1.02E+00
1.29E+02
1.23E+02
1.25E+02
8.22E-01
1.27E+02
1.23E+02
1.26E+02
1.18E+00
1.29E+02
1.22E+02
1.28E+02
1.79E+00
1.33E+02
1.23E+02
1.16E+02
PASS
1.27E+02
1.39E+00
1.31E+02
1.23E+02
1.10E+02
PASS
1.28E+02
8.59E-01
1.30E+02
1.25E+02
1.10E+02
PASS
1.28E+02
1.82E+00
1.32E+02
1.23E+02
1.10E+02
PASS
1.26E+02
2.19E+00
1.32E+02
1.20E+02
1.10E+02
PASS
1.27E+02
1.51E+00
1.32E+02
1.23E+02
1.10E+02
PASS
1.26E+02
1.24E+00
1.29E+02
1.22E+02
1.10E+02
PASS
An ISO 9001:2000 Certified Company
452
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #3 (dB)
1.30E+02
1.25E+02
1.20E+02
1.15E+02
1.10E+02
1.05E+02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.223. Plot of Large Signal Voltage Gain @ 5V #3 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
453
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.223. Raw data for Large Signal Voltage Gain @ 5V #3 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.29E+02
1.28E+02
1.27E+02
1.31E+02
1.27E+02
1.30E+02
1.27E+02
1.26E+02
1.27E+02
1.26E+02
1.27E+02
10
1.28E+02
1.29E+02
1.25E+02
1.27E+02
1.28E+02
1.29E+02
1.27E+02
1.26E+02
1.26E+02
1.26E+02
1.26E+02
20
1.27E+02
1.26E+02
1.25E+02
1.24E+02
1.29E+02
1.28E+02
1.27E+02
1.26E+02
1.26E+02
1.26E+02
1.26E+02
30
1.28E+02
1.27E+02
1.25E+02
1.26E+02
1.27E+02
1.27E+02
1.26E+02
1.28E+02
1.26E+02
1.25E+02
1.26E+02
50
1.27E+02
1.27E+02
1.25E+02
1.23E+02
1.27E+02
1.28E+02
1.26E+02
1.26E+02
1.25E+02
1.24E+02
1.26E+02
60
1.26E+02
1.26E+02
1.25E+02
1.25E+02
1.25E+02
1.28E+02
1.29E+02
1.27E+02
1.27E+02
1.26E+02
1.27E+02
70
1.28E+02
1.29E+02
1.25E+02
1.25E+02
1.27E+02
1.28E+02
1.27E+02
1.25E+02
1.27E+02
1.26E+02
1.26E+02
1.29E+02
1.50E+00
1.33E+02
1.24E+02
1.27E+02
1.52E+00
1.31E+02
1.23E+02
1.26E+02
1.78E+00
1.31E+02
1.21E+02
1.27E+02
1.24E+00
1.30E+02
1.23E+02
1.26E+02
1.61E+00
1.30E+02
1.21E+02
1.26E+02
5.41E-01
1.27E+02
1.24E+02
1.27E+02
1.67E+00
1.31E+02
1.22E+02
1.27E+02
1.49E+00
1.31E+02
1.23E+02
1.16E+02
PASS
1.27E+02
1.44E+00
1.31E+02
1.23E+02
1.10E+02
PASS
1.27E+02
6.30E-01
1.28E+02
1.25E+02
1.10E+02
PASS
1.26E+02
1.12E+00
1.29E+02
1.23E+02
1.10E+02
PASS
1.26E+02
1.57E+00
1.30E+02
1.22E+02
1.10E+02
PASS
1.28E+02
1.28E+00
1.31E+02
1.24E+02
1.10E+02
PASS
1.27E+02
1.04E+00
1.30E+02
1.24E+02
1.10E+02
PASS
An ISO 9001:2000 Certified Company
454
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Large Signal Voltage Gain @ 5V #4 (dB)
1.30E+02
1.28E+02
1.26E+02
1.24E+02
1.22E+02
1.20E+02
1.18E+02
1.16E+02
1.14E+02
1.12E+02
1.10E+02
1.08E+02
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.224. Plot of Large Signal Voltage Gain @ 5V #4 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
455
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.224. Raw data for Large Signal Voltage Gain @ 5V #4 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Large Signal Voltage Gain @ 5V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.27E+02
1.25E+02
1.29E+02
1.27E+02
1.27E+02
1.27E+02
1.26E+02
1.28E+02
1.26E+02
1.26E+02
1.29E+02
10
1.26E+02
1.26E+02
1.28E+02
1.27E+02
1.26E+02
1.26E+02
1.24E+02
1.27E+02
1.27E+02
1.26E+02
1.28E+02
20
1.26E+02
1.26E+02
1.28E+02
1.27E+02
1.24E+02
1.29E+02
1.25E+02
1.26E+02
1.26E+02
1.26E+02
1.29E+02
30
1.26E+02
1.25E+02
1.28E+02
1.28E+02
1.25E+02
1.25E+02
1.25E+02
1.26E+02
1.25E+02
1.26E+02
1.31E+02
50
1.26E+02
1.24E+02
1.27E+02
1.26E+02
1.25E+02
1.27E+02
1.25E+02
1.26E+02
1.24E+02
1.26E+02
1.28E+02
60
1.27E+02
1.25E+02
1.27E+02
1.26E+02
1.25E+02
1.24E+02
1.27E+02
1.26E+02
1.26E+02
1.25E+02
1.26E+02
70
1.26E+02
1.25E+02
1.27E+02
1.27E+02
1.25E+02
1.25E+02
1.25E+02
1.25E+02
1.26E+02
1.25E+02
1.29E+02
1.27E+02
1.28E+00
1.31E+02
1.24E+02
1.26E+02
9.88E-01
1.29E+02
1.24E+02
1.26E+02
1.28E+00
1.30E+02
1.23E+02
1.26E+02
1.59E+00
1.31E+02
1.22E+02
1.26E+02
1.21E+00
1.29E+02
1.22E+02
1.26E+02
1.24E+00
1.29E+02
1.23E+02
1.26E+02
8.67E-01
1.28E+02
1.24E+02
1.27E+02
5.48E-01
1.28E+02
1.25E+02
1.16E+02
PASS
1.26E+02
1.17E+00
1.29E+02
1.23E+02
1.10E+02
PASS
1.26E+02
1.55E+00
1.30E+02
1.22E+02
1.10E+02
PASS
1.26E+02
4.34E-01
1.27E+02
1.25E+02
1.10E+02
PASS
1.26E+02
1.26E+00
1.29E+02
1.22E+02
1.10E+02
PASS
1.25E+02
1.22E+00
1.29E+02
1.22E+02
1.10E+02
PASS
1.25E+02
3.98E-01
1.26E+02
1.24E+02
1.10E+02
PASS
An ISO 9001:2000 Certified Company
456
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ 5V #1 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.225. Plot of Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
457
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.225. Raw data for Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 5V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.33E+01
1.06E+02
8.54E+01
9.07E+01
1.08E+02
8.74E+01
8.73E+01
9.38E+01
8.43E+01
9.48E+01
9.97E+01
10
8.35E+01
1.05E+02
8.54E+01
9.07E+01
1.05E+02
8.73E+01
8.73E+01
9.44E+01
8.42E+01
9.57E+01
9.93E+01
20
8.36E+01
1.04E+02
8.54E+01
9.07E+01
1.04E+02
8.72E+01
8.72E+01
9.46E+01
8.41E+01
9.59E+01
9.94E+01
30
8.37E+01
1.04E+02
8.53E+01
9.08E+01
1.05E+02
8.72E+01
8.72E+01
9.46E+01
8.41E+01
9.59E+01
9.95E+01
50
8.37E+01
1.04E+02
8.52E+01
9.08E+01
1.06E+02
8.71E+01
8.72E+01
9.48E+01
8.40E+01
9.61E+01
9.96E+01
60
8.37E+01
1.04E+02
8.52E+01
9.07E+01
1.06E+02
8.71E+01
8.73E+01
9.46E+01
8.41E+01
9.60E+01
9.96E+01
70
8.41E+01
1.05E+02
8.53E+01
9.15E+01
1.03E+02
8.79E+01
8.71E+01
9.50E+01
8.41E+01
9.97E+01
9.96E+01
9.48E+01
1.17E+01
1.27E+02
6.27E+01
9.39E+01
1.04E+01
1.22E+02
6.53E+01
9.36E+01
9.95E+00
1.21E+02
6.63E+01
9.39E+01
1.04E+01
1.22E+02
6.54E+01
9.38E+01
1.03E+01
1.22E+02
6.56E+01
9.39E+01
1.04E+01
1.22E+02
6.54E+01
9.37E+01
9.72E+00
1.20E+02
6.71E+01
8.95E+01
4.55E+00
1.02E+02
7.70E+01
7.60E+01
FAIL
8.98E+01
5.01E+00
1.04E+02
7.61E+01
7.00E+01
FAIL
8.98E+01
5.13E+00
1.04E+02
7.57E+01
7.00E+01
FAIL
8.98E+01
5.16E+00
1.04E+02
7.56E+01
7.00E+01
FAIL
8.99E+01
5.30E+00
1.04E+02
7.53E+01
7.00E+01
FAIL
8.98E+01
5.20E+00
1.04E+02
7.55E+01
7.00E+01
FAIL
9.07E+01
6.42E+00
1.08E+02
7.31E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
458
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ 5V #2 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.226. Plot of Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
459
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.226. Raw data for Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 5V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.95E+01
8.89E+01
8.96E+01
8.19E+01
8.60E+01
8.39E+01
8.91E+01
1.32E+02
8.89E+01
9.00E+01
9.63E+01
10
1.00E+02
8.88E+01
8.97E+01
8.21E+01
8.60E+01
8.37E+01
8.88E+01
1.19E+02
8.90E+01
8.99E+01
9.57E+01
20
1.00E+02
8.89E+01
8.97E+01
8.22E+01
8.59E+01
8.37E+01
8.87E+01
1.18E+02
8.89E+01
8.99E+01
9.64E+01
30
1.01E+02
8.88E+01
8.97E+01
8.22E+01
8.59E+01
8.37E+01
8.86E+01
1.16E+02
8.89E+01
8.98E+01
9.59E+01
50
1.02E+02
8.85E+01
8.97E+01
8.23E+01
8.59E+01
8.36E+01
8.84E+01
1.15E+02
8.86E+01
8.96E+01
9.59E+01
60
1.02E+02
8.85E+01
8.97E+01
8.23E+01
8.60E+01
8.37E+01
8.84E+01
1.16E+02
8.86E+01
8.97E+01
9.63E+01
70
9.84E+01
8.96E+01
8.91E+01
8.22E+01
8.66E+01
8.39E+01
8.86E+01
1.24E+02
8.90E+01
9.07E+01
9.64E+01
8.92E+01
6.49E+00
1.07E+02
7.14E+01
8.94E+01
6.85E+00
1.08E+02
7.06E+01
8.94E+01
6.85E+00
1.08E+02
7.06E+01
8.95E+01
7.03E+00
1.09E+02
7.02E+01
8.97E+01
7.60E+00
1.11E+02
6.89E+01
8.97E+01
7.36E+00
1.10E+02
6.95E+01
8.92E+01
5.93E+00
1.05E+02
7.29E+01
9.67E+01
1.96E+01
1.50E+02
4.29E+01
7.60E+01
FAIL
9.41E+01
1.41E+01
1.33E+02
5.53E+01
7.00E+01
FAIL
9.38E+01
1.37E+01
1.31E+02
5.63E+01
7.00E+01
FAIL
9.33E+01
1.27E+01
1.28E+02
5.84E+01
7.00E+01
FAIL
9.31E+01
1.26E+01
1.28E+02
5.85E+01
7.00E+01
FAIL
9.33E+01
1.29E+01
1.29E+02
5.79E+01
7.00E+01
FAIL
9.53E+01
1.63E+01
1.40E+02
5.05E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
460
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ 5V #3 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.227. Plot of Common Mode Rejection Ratio @ 5V #3 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
461
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.227. Raw data for Common Mode Rejection Ratio @ 5V #3 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 5V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
9.21E+01
8.40E+01
8.28E+01
8.47E+01
9.87E+01
9.15E+01
9.63E+01
8.16E+01
9.07E+01
8.49E+01
8.28E+01
10
9.14E+01
8.42E+01
8.29E+01
8.46E+01
9.83E+01
9.12E+01
9.59E+01
8.15E+01
9.06E+01
8.49E+01
8.29E+01
20
9.12E+01
8.43E+01
8.31E+01
8.46E+01
9.81E+01
9.10E+01
9.56E+01
8.16E+01
9.05E+01
8.50E+01
8.28E+01
30
9.10E+01
8.43E+01
8.31E+01
8.46E+01
9.79E+01
9.09E+01
9.55E+01
8.15E+01
9.05E+01
8.49E+01
8.28E+01
50
9.06E+01
8.44E+01
8.34E+01
8.44E+01
9.72E+01
9.07E+01
9.55E+01
8.16E+01
9.05E+01
8.49E+01
8.29E+01
60
9.06E+01
8.45E+01
8.33E+01
8.45E+01
9.74E+01
9.08E+01
9.55E+01
8.16E+01
9.04E+01
8.49E+01
8.28E+01
70
9.06E+01
8.45E+01
8.31E+01
8.43E+01
9.66E+01
9.18E+01
9.57E+01
8.16E+01
9.05E+01
8.51E+01
8.28E+01
8.85E+01
6.77E+00
1.07E+02
6.99E+01
8.83E+01
6.51E+00
1.06E+02
7.05E+01
8.83E+01
6.35E+00
1.06E+02
7.08E+01
8.82E+01
6.25E+00
1.05E+02
7.11E+01
8.80E+01
5.89E+00
1.04E+02
7.19E+01
8.81E+01
5.95E+00
1.04E+02
7.17E+01
8.78E+01
5.71E+00
1.03E+02
7.21E+01
8.90E+01
5.76E+00
1.05E+02
7.32E+01
7.60E+01
FAIL
8.88E+01
5.63E+00
1.04E+02
7.34E+01
7.00E+01
PASS
8.87E+01
5.51E+00
1.04E+02
7.36E+01
7.00E+01
PASS
8.87E+01
5.47E+00
1.04E+02
7.37E+01
7.00E+01
PASS
8.87E+01
5.44E+00
1.04E+02
7.37E+01
7.00E+01
PASS
8.87E+01
5.45E+00
1.04E+02
7.37E+01
7.00E+01
PASS
8.89E+01
5.60E+00
1.04E+02
7.36E+01
7.00E+01
PASS
An ISO 9001:2000 Certified Company
462
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio @ 5V #4 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.228. Plot of Common Mode Rejection Ratio @ 5V #4 (dB) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
463
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.228. Raw data for Common Mode Rejection Ratio @ 5V #4 (dB) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio @ 5V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.03E+02
9.30E+01
8.85E+01
9.27E+01
1.12E+02
8.89E+01
8.53E+01
8.31E+01
8.45E+01
9.21E+01
9.48E+01
10
1.02E+02
9.30E+01
8.85E+01
9.24E+01
1.19E+02
8.88E+01
8.53E+01
8.29E+01
8.45E+01
9.17E+01
9.47E+01
20
1.01E+02
9.28E+01
8.86E+01
9.23E+01
1.20E+02
8.87E+01
8.53E+01
8.28E+01
8.44E+01
9.16E+01
9.47E+01
30
1.00E+02
9.28E+01
8.85E+01
9.21E+01
1.21E+02
8.87E+01
8.53E+01
8.28E+01
8.44E+01
9.16E+01
9.49E+01
50
9.99E+01
9.28E+01
8.85E+01
9.19E+01
1.45E+02
8.85E+01
8.53E+01
8.27E+01
8.43E+01
9.15E+01
9.49E+01
60
9.99E+01
9.28E+01
8.85E+01
9.19E+01
1.34E+02
8.85E+01
8.53E+01
8.27E+01
8.43E+01
9.15E+01
9.49E+01
70
1.00E+02
9.27E+01
8.77E+01
9.25E+01
1.30E+02
8.87E+01
8.48E+01
8.26E+01
8.42E+01
9.21E+01
9.49E+01
9.77E+01
9.36E+00
1.23E+02
7.21E+01
9.88E+01
1.20E+01
1.32E+02
6.59E+01
9.90E+01
1.28E+01
1.34E+02
6.40E+01
9.90E+01
1.30E+01
1.35E+02
6.32E+01
1.04E+02
2.37E+01
1.69E+02
3.88E+01
1.02E+02
1.89E+01
1.53E+02
4.98E+01
1.01E+02
1.72E+01
1.48E+02
5.34E+01
8.68E+01
3.65E+00
9.68E+01
7.68E+01
7.60E+01
FAIL
8.66E+01
3.57E+00
9.64E+01
7.69E+01
7.00E+01
FAIL
8.66E+01
3.55E+00
9.63E+01
7.68E+01
7.00E+01
FAIL
8.65E+01
3.55E+00
9.63E+01
7.68E+01
7.00E+01
FAIL
8.65E+01
3.54E+00
9.62E+01
7.68E+01
7.00E+01
FAIL
8.65E+01
3.53E+00
9.61E+01
7.68E+01
7.00E+01
FAIL
8.65E+01
3.87E+00
9.71E+01
7.59E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
464
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching 1-4 @ 5V
(dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.10E+02
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.229. Plot of Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
465
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.229. Raw data for Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching 1-4 @ 5V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.42E+01
9.52E+01
9.59E+01
1.04E+02
1.04E+02
1.03E+02
9.89E+01
8.09E+01
1.16E+02
8.73E+01
1.02E+02
10
8.47E+01
9.56E+01
9.56E+01
1.05E+02
1.04E+02
1.03E+02
9.89E+01
8.09E+01
1.16E+02
8.75E+01
1.03E+02
20
8.49E+01
9.55E+01
9.56E+01
1.06E+02
1.03E+02
1.03E+02
9.93E+01
8.09E+01
1.14E+02
8.75E+01
1.02E+02
30
8.50E+01
9.55E+01
9.53E+01
1.08E+02
1.04E+02
1.03E+02
9.92E+01
8.08E+01
1.14E+02
8.75E+01
1.03E+02
50
8.52E+01
9.57E+01
9.51E+01
1.09E+02
1.06E+02
1.03E+02
9.91E+01
8.08E+01
1.15E+02
8.75E+01
1.03E+02
60
8.52E+01
9.56E+01
9.52E+01
1.09E+02
1.05E+02
1.04E+02
9.89E+01
8.07E+01
1.16E+02
8.74E+01
1.03E+02
70
8.56E+01
9.51E+01
9.74E+01
1.11E+02
1.03E+02
1.08E+02
9.75E+01
8.08E+01
1.23E+02
8.91E+01
1.02E+02
9.67E+01
8.20E+00
1.19E+02
7.42E+01
9.70E+01
8.19E+00
1.19E+02
7.45E+01
9.70E+01
8.21E+00
1.19E+02
7.45E+01
9.75E+01
8.79E+00
1.22E+02
7.34E+01
9.81E+01
9.37E+00
1.24E+02
7.24E+01
9.81E+01
9.33E+00
1.24E+02
7.25E+01
9.84E+01
9.43E+00
1.24E+02
7.26E+01
9.74E+01
1.39E+01
1.36E+02
5.93E+01
7.50E+01
FAIL
9.72E+01
1.36E+01
1.35E+02
5.99E+01
7.00E+01
FAIL
9.70E+01
1.32E+01
1.33E+02
6.09E+01
7.00E+01
FAIL
9.69E+01
1.31E+01
1.33E+02
6.11E+01
7.00E+01
FAIL
9.72E+01
1.36E+01
1.34E+02
6.00E+01
7.00E+01
FAIL
9.73E+01
1.38E+01
1.35E+02
5.95E+01
7.00E+01
FAIL
9.97E+01
1.64E+01
1.45E+02
5.47E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
466
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Common Mode Rejection Ratio Matching 2-3 @ 5V
(dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.00E+02
9.00E+01
8.00E+01
7.00E+01
6.00E+01
5.00E+01
4.00E+01
3.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.230. Plot of Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) versus total dose. The data
show no significant change with radiation. The solid diamonds are the average of the measured data points for
the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data
points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the sample irradiated under electrical bias
while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
467
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.230. Raw data for Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) versus
total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Common Mode Rejection Ratio Matching 2-3 @ 5V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
8.90E+01
9.14E+01
8.81E+01
9.32E+01
8.83E+01
8.86E+01
9.41E+01
8.17E+01
1.03E+02
9.20E+01
8.48E+01
10
8.88E+01
9.19E+01
8.83E+01
9.41E+01
8.83E+01
8.85E+01
9.39E+01
8.17E+01
1.04E+02
9.22E+01
8.51E+01
20
8.86E+01
9.21E+01
8.85E+01
9.44E+01
8.84E+01
8.86E+01
9.38E+01
8.17E+01
1.04E+02
9.23E+01
8.49E+01
30
8.86E+01
9.22E+01
8.86E+01
9.47E+01
8.84E+01
8.86E+01
9.38E+01
8.17E+01
1.04E+02
9.23E+01
8.50E+01
50
8.86E+01
9.29E+01
8.91E+01
9.54E+01
8.87E+01
8.87E+01
9.34E+01
8.18E+01
1.03E+02
9.26E+01
8.50E+01
60
8.85E+01
9.30E+01
8.90E+01
9.54E+01
8.87E+01
8.87E+01
9.34E+01
8.17E+01
1.03E+02
9.24E+01
8.49E+01
70
8.76E+01
9.15E+01
8.90E+01
9.56E+01
8.99E+01
8.84E+01
9.37E+01
8.15E+01
1.05E+02
9.15E+01
8.49E+01
9.00E+01
2.20E+00
9.61E+01
8.40E+01
9.03E+01
2.60E+00
9.74E+01
8.32E+01
9.04E+01
2.73E+00
9.79E+01
8.29E+01
9.05E+01
2.83E+00
9.83E+01
8.28E+01
9.10E+01
3.07E+00
9.94E+01
8.25E+01
9.09E+01
3.10E+00
9.94E+01
8.24E+01
9.07E+01
3.07E+00
9.92E+01
8.23E+01
9.19E+01
7.91E+00
1.14E+02
7.02E+01
7.50E+01
FAIL
9.21E+01
8.33E+00
1.15E+02
6.93E+01
7.00E+01
FAIL
9.21E+01
8.20E+00
1.15E+02
6.96E+01
7.00E+01
FAIL
9.21E+01
8.23E+00
1.15E+02
6.96E+01
7.00E+01
FAIL
9.19E+01
7.70E+00
1.13E+02
7.08E+01
7.00E+01
PASS
9.19E+01
7.81E+00
1.13E+02
7.05E+01
7.00E+01
PASS
9.21E+01
8.76E+00
1.16E+02
6.81E+01
7.00E+01
FAIL
An ISO 9001:2000 Certified Company
468
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ 2.2V-12V #1 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.231. Plot of Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
469
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.231. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ 2.2V-12V #1 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.15E+02
1.00E+02
1.02E+02
1.11E+02
1.05E+02
1.12E+02
1.13E+02
1.15E+02
1.12E+02
1.20E+02
1.11E+02
10
1.15E+02
1.01E+02
1.03E+02
1.11E+02
1.05E+02
1.12E+02
1.13E+02
1.15E+02
1.12E+02
1.21E+02
1.11E+02
20
1.15E+02
1.01E+02
1.02E+02
1.11E+02
1.04E+02
1.09E+02
1.11E+02
1.12E+02
1.13E+02
1.14E+02
1.09E+02
30
1.13E+02
1.01E+02
1.02E+02
1.09E+02
1.04E+02
1.09E+02
1.11E+02
1.12E+02
1.13E+02
1.13E+02
1.09E+02
50
1.74E+01
1.72E+01
1.74E+01
1.69E+01
1.73E+01
1.09E+02
1.11E+02
1.11E+02
1.13E+02
1.13E+02
1.09E+02
60
1.75E+01
1.73E+01
1.74E+01
1.69E+01
1.72E+01
1.09E+02
1.11E+02
1.12E+02
1.13E+02
1.14E+02
1.09E+02
70
1.16E+02
1.01E+02
1.02E+02
1.12E+02
1.04E+02
1.09E+02
1.11E+02
1.12E+02
1.13E+02
1.14E+02
1.09E+02
1.07E+02
6.18E+00
1.24E+02
8.98E+01
1.07E+02
6.04E+00
1.23E+02
9.02E+01
1.07E+02
6.20E+00
1.24E+02
8.95E+01
1.06E+02
5.39E+00
1.21E+02
9.10E+01
1.72E+01
1.80E-01
1.77E+01
1.68E+01
1.73E+01
2.19E-01
1.79E+01
1.67E+01
1.07E+02
6.66E+00
1.25E+02
8.86E+01
1.14E+02
3.26E+00
1.23E+02
1.05E+02
8.80E+01
PASS
1.15E+02
3.52E+00
1.24E+02
1.05E+02
8.80E+01
PASS
1.12E+02
1.59E+00
1.16E+02
1.07E+02
8.80E+01
PASS
1.12E+02
1.55E+00
1.16E+02
1.07E+02
8.80E+01
PASS
1.12E+02
1.67E+00
1.16E+02
1.07E+02
8.80E+01
FAIL
1.12E+02
1.65E+00
1.16E+02
1.07E+02
8.80E+01
FAIL
1.12E+02
1.56E+00
1.16E+02
1.07E+02
8.80E+01
PASS
An ISO 9001:2000 Certified Company
470
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ 2.2V-12V #2 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
-2.00E+01
-4.00E+01
-6.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.232. Plot of Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
471
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.232. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ 2.2V-12V #2 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.09E+02
1.08E+02
1.11E+02
1.04E+02
1.03E+02
9.96E+01
1.28E+02
1.08E+02
1.07E+02
1.02E+02
1.06E+02
10
1.09E+02
1.08E+02
1.12E+02
1.04E+02
1.03E+02
9.97E+01
1.33E+02
1.08E+02
1.07E+02
1.03E+02
1.06E+02
20
1.10E+02
1.07E+02
1.11E+02
1.04E+02
1.03E+02
9.97E+01
1.18E+02
1.06E+02
1.05E+02
1.03E+02
1.05E+02
30
1.08E+02
1.06E+02
1.09E+02
1.03E+02
1.03E+02
9.97E+01
1.17E+02
1.06E+02
1.05E+02
1.03E+02
1.04E+02
50
7.95E+01
1.70E+01
7.85E+01
1.70E+01
7.86E+01
9.96E+01
1.19E+02
1.07E+02
1.05E+02
1.03E+02
1.04E+02
60
7.95E+01
1.71E+01
7.85E+01
1.69E+01
7.86E+01
9.96E+01
1.18E+02
1.06E+02
1.05E+02
1.03E+02
1.04E+02
70
1.10E+02
1.08E+02
1.11E+02
1.04E+02
1.04E+02
9.96E+01
1.18E+02
1.06E+02
1.05E+02
1.03E+02
1.04E+02
1.07E+02
3.48E+00
1.17E+02
9.75E+01
1.07E+02
3.63E+00
1.17E+02
9.72E+01
1.07E+02
3.40E+00
1.16E+02
9.77E+01
1.06E+02
3.04E+00
1.14E+02
9.75E+01
5.41E+01
3.39E+01
1.47E+02
-3.88E+01
5.41E+01
3.39E+01
1.47E+02
-3.88E+01
1.07E+02
3.41E+00
1.17E+02
9.78E+01
1.09E+02
1.10E+01
1.39E+02
7.89E+01
8.80E+01
FAIL
1.10E+02
1.32E+01
1.46E+02
7.40E+01
8.80E+01
FAIL
1.06E+02
6.81E+00
1.25E+02
8.77E+01
8.80E+01
FAIL
1.06E+02
6.66E+00
1.25E+02
8.80E+01
8.80E+01
PASS
1.07E+02
7.20E+00
1.26E+02
8.68E+01
8.80E+01
FAIL
1.07E+02
7.14E+00
1.26E+02
8.70E+01
8.80E+01
FAIL
1.07E+02
7.14E+00
1.26E+02
8.70E+01
8.80E+01
FAIL
An ISO 9001:2000 Certified Company
472
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ 2.2V-12V #3 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.233. Plot of Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
473
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.233. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ 2.2V-12V #3 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.04E+02
1.02E+02
1.14E+02
1.03E+02
1.07E+02
1.07E+02
1.32E+02
1.06E+02
1.06E+02
1.11E+02
1.06E+02
10
1.04E+02
1.02E+02
1.13E+02
1.03E+02
1.07E+02
1.07E+02
1.39E+02
1.06E+02
1.06E+02
1.11E+02
1.07E+02
20
1.03E+02
1.01E+02
1.12E+02
1.03E+02
1.06E+02
1.07E+02
1.18E+02
1.05E+02
1.06E+02
1.10E+02
1.06E+02
30
1.03E+02
1.01E+02
1.11E+02
1.03E+02
1.06E+02
1.07E+02
1.19E+02
1.05E+02
1.06E+02
1.10E+02
1.06E+02
50
1.69E+01
1.72E+01
1.71E+01
1.70E+01
1.69E+01
1.07E+02
1.21E+02
1.05E+02
1.06E+02
1.10E+02
1.06E+02
60
1.69E+01
1.72E+01
1.70E+01
1.70E+01
1.68E+01
1.07E+02
1.19E+02
1.05E+02
1.06E+02
1.10E+02
1.06E+02
70
1.03E+02
1.01E+02
1.13E+02
1.04E+02
1.06E+02
1.07E+02
1.20E+02
1.05E+02
1.06E+02
1.10E+02
1.06E+02
1.06E+02
5.03E+00
1.20E+02
9.23E+01
1.06E+02
4.54E+00
1.18E+02
9.35E+01
1.05E+02
4.24E+00
1.17E+02
9.36E+01
1.05E+02
3.70E+00
1.15E+02
9.46E+01
1.70E+01
1.47E-01
1.74E+01
1.66E+01
1.70E+01
1.23E-01
1.73E+01
1.66E+01
1.05E+02
4.37E+00
1.17E+02
9.34E+01
1.12E+02
1.13E+01
1.43E+02
8.15E+01
8.80E+01
FAIL
1.14E+02
1.40E+01
1.52E+02
7.54E+01
8.80E+01
FAIL
1.09E+02
5.46E+00
1.24E+02
9.42E+01
8.80E+01
PASS
1.09E+02
5.83E+00
1.25E+02
9.35E+01
8.80E+01
PASS
1.10E+02
6.34E+00
1.27E+02
9.24E+01
8.80E+01
FAIL
1.09E+02
5.62E+00
1.25E+02
9.40E+01
8.80E+01
FAIL
1.10E+02
6.08E+00
1.26E+02
9.30E+01
8.80E+01
PASS
An ISO 9001:2000 Certified Company
474
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio @ 2.2V-12V #4 (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
-2.00E+01
-4.00E+01
-6.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.234. Plot of Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) versus total dose. The data show a
significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the
average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are
the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet
and/or test plan.
An ISO 9001:2000 Certified Company
475
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.234. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio @ 2.2V-12V #4 (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.49E+02
1.06E+02
1.06E+02
1.34E+02
1.18E+02
1.02E+02
1.05E+02
1.12E+02
1.04E+02
1.01E+02
1.11E+02
10
1.33E+02
1.06E+02
1.06E+02
1.31E+02
1.18E+02
1.02E+02
1.05E+02
1.12E+02
1.04E+02
1.01E+02
1.11E+02
20
1.39E+02
1.06E+02
1.05E+02
1.26E+02
1.15E+02
1.02E+02
1.04E+02
1.10E+02
1.04E+02
1.01E+02
1.09E+02
30
1.28E+02
1.05E+02
1.05E+02
1.26E+02
1.14E+02
1.02E+02
1.04E+02
1.10E+02
1.04E+02
1.01E+02
1.09E+02
50
1.74E+01
7.89E+01
1.70E+01
1.68E+01
1.71E+01
1.02E+02
1.04E+02
1.10E+02
1.04E+02
1.01E+02
1.09E+02
60
1.75E+01
7.90E+01
1.71E+01
1.68E+01
1.71E+01
1.02E+02
1.04E+02
1.10E+02
1.04E+02
1.01E+02
1.09E+02
70
1.42E+02
1.06E+02
1.05E+02
1.27E+02
1.16E+02
1.02E+02
1.04E+02
1.10E+02
1.04E+02
1.01E+02
1.09E+02
1.23E+02
1.88E+01
1.74E+02
7.10E+01
1.19E+02
1.31E+01
1.55E+02
8.31E+01
1.18E+02
1.43E+01
1.57E+02
7.91E+01
1.16E+02
1.09E+01
1.45E+02
8.58E+01
2.95E+01
2.77E+01
1.05E+02
-4.64E+01
2.95E+01
2.77E+01
1.05E+02
-4.64E+01
1.19E+02
1.57E+01
1.62E+02
7.61E+01
1.05E+02
4.19E+00
1.16E+02
9.31E+01
8.80E+01
FAIL
1.05E+02
4.35E+00
1.17E+02
9.29E+01
8.80E+01
FAIL
1.04E+02
3.66E+00
1.14E+02
9.41E+01
8.80E+01
FAIL
1.04E+02
3.71E+00
1.14E+02
9.40E+01
8.80E+01
FAIL
1.04E+02
3.68E+00
1.14E+02
9.41E+01
8.80E+01
FAIL
1.04E+02
3.66E+00
1.14E+02
9.41E+01
8.80E+01
FAIL
1.04E+02
3.71E+00
1.14E+02
9.40E+01
8.80E+01
FAIL
An ISO 9001:2000 Certified Company
476
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio Matching 1-4 @ 2.2V12V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
-2.00E+01
-4.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.235. Plot of Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB) versus total dose. The
data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
477
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.235. Raw data for Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.15E+02
1.07E+02
1.11E+02
1.10E+02
1.07E+02
1.05E+02
1.09E+02
1.22E+02
1.08E+02
1.02E+02
1.46E+02
10
1.14E+02
1.07E+02
1.11E+02
1.10E+02
1.07E+02
1.05E+02
1.09E+02
1.25E+02
1.08E+02
1.02E+02
1.50E+02
20
1.16E+02
1.08E+02
1.12E+02
1.13E+02
1.06E+02
1.07E+02
1.09E+02
1.27E+02
1.08E+02
1.03E+02
1.60E+02
30
1.15E+02
1.08E+02
1.12E+02
1.10E+02
1.07E+02
1.07E+02
1.09E+02
1.28E+02
1.08E+02
1.03E+02
1.79E+02
50
7.95E+01
1.73E+01
4.60E+01
5.42E+01
5.02E+01
1.07E+02
1.09E+02
1.39E+02
1.08E+02
1.03E+02
1.54E+02
60
9.94E+01
1.73E+01
4.54E+01
5.64E+01
5.15E+01
1.07E+02
1.09E+02
1.25E+02
1.08E+02
1.03E+02
1.46E+02
70
1.16E+02
1.08E+02
1.12E+02
1.14E+02
1.06E+02
1.07E+02
1.09E+02
1.27E+02
1.08E+02
1.03E+02
1.62E+02
1.10E+02
3.28E+00
1.19E+02
1.01E+02
1.10E+02
2.91E+00
1.18E+02
1.02E+02
1.11E+02
3.76E+00
1.21E+02
1.01E+02
1.11E+02
3.25E+00
1.20E+02
1.02E+02
4.94E+01
2.22E+01
1.10E+02
-1.15E+01
5.40E+01
2.96E+01
1.35E+02
-2.70E+01
1.11E+02
4.11E+00
1.23E+02
1.00E+02
1.09E+02
7.79E+00
1.31E+02
8.79E+01
8.20E+01
PASS
1.10E+02
8.70E+00
1.34E+02
8.59E+01
8.20E+01
PASS
1.11E+02
9.41E+00
1.37E+02
8.49E+01
8.20E+01
PASS
1.11E+02
9.54E+00
1.37E+02
8.47E+01
8.20E+01
PASS
1.13E+02
1.47E+01
1.53E+02
7.29E+01
8.20E+01
FAIL
1.10E+02
8.69E+00
1.34E+02
8.65E+01
8.20E+01
FAIL
1.11E+02
9.32E+00
1.36E+02
8.51E+01
8.20E+01
PASS
An ISO 9001:2000 Certified Company
478
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Power Supply Rejection Ratio Matching 2-3 @ 2.2V12V (dB)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
1.40E+02
1.20E+02
1.00E+02
8.00E+01
6.00E+01
4.00E+01
2.00E+01
0.00E+00
-2.00E+01
-4.00E+01
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.236. Plot of Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB) versus total dose. The
data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid
diamonds are the average of the measured data points for the sample irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the
average of the data points after application of the KTL statistics on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
479
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.236. Raw data for Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB)
versus total dose, including the statistical analysis, specification and the status of the testing
(pass/fail).
Total Dose (krad(Si))
Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
1.11E+02
1.08E+02
1.22E+02
1.27E+02
1.12E+02
1.04E+02
1.35E+02
1.17E+02
1.27E+02
1.06E+02
1.35E+02
10
1.11E+02
1.08E+02
1.27E+02
1.30E+02
1.12E+02
1.04E+02
1.39E+02
1.18E+02
1.28E+02
1.06E+02
1.26E+02
20
1.09E+02
1.07E+02
1.27E+02
1.31E+02
1.15E+02
1.05E+02
1.40E+02
1.22E+02
1.27E+02
1.08E+02
1.22E+02
30
1.11E+02
1.09E+02
1.26E+02
1.29E+02
1.13E+02
1.05E+02
1.31E+02
1.24E+02
1.25E+02
1.08E+02
1.22E+02
50
1.69E+01
4.96E+01
1.71E+01
6.20E+01
1.69E+01
1.05E+02
1.32E+02
1.23E+02
1.26E+02
1.08E+02
1.18E+02
60
1.69E+01
5.67E+01
1.70E+01
6.33E+01
1.68E+01
1.05E+02
1.46E+02
1.23E+02
1.28E+02
1.08E+02
1.18E+02
70
1.09E+02
1.07E+02
1.27E+02
1.35E+02
1.17E+02
1.05E+02
1.34E+02
1.23E+02
1.26E+02
1.08E+02
1.21E+02
1.16E+02
8.27E+00
1.39E+02
9.34E+01
1.17E+02
1.00E+01
1.45E+02
8.99E+01
1.18E+02
1.07E+01
1.47E+02
8.86E+01
1.18E+02
9.52E+00
1.44E+02
9.14E+01
3.25E+01
2.17E+01
9.21E+01
-2.71E+01
3.42E+01
2.37E+01
9.92E+01
-3.09E+01
1.19E+02
1.18E+01
1.51E+02
8.65E+01
1.18E+02
1.32E+01
1.54E+02
8.21E+01
8.20E+01
PASS
1.19E+02
1.46E+01
1.59E+02
7.91E+01
8.20E+01
FAIL
1.20E+02
1.42E+01
1.59E+02
8.13E+01
8.20E+01
FAIL
1.19E+02
1.14E+01
1.50E+02
8.73E+01
8.20E+01
PASS
1.19E+02
1.19E+01
1.51E+02
8.62E+01
8.20E+01
FAIL
1.22E+02
1.66E+01
1.68E+02
7.65E+01
8.20E+01
FAIL
1.19E+02
1.24E+01
1.53E+02
8.52E+01
8.20E+01
PASS
An ISO 9001:2000 Certified Company
480
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.237. Plot of Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
481
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.237. Raw data for Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.25E-03
3.98E-03
3.91E-03
3.91E-03
3.97E-03
4.17E-03
3.93E-03
4.08E-03
3.83E-03
3.96E-03
4.10E-03
10
4.25E-03
3.95E-03
3.85E-03
3.95E-03
4.03E-03
4.24E-03
4.04E-03
4.09E-03
3.87E-03
3.88E-03
4.17E-03
20
4.27E-03
4.00E-03
3.93E-03
4.05E-03
4.13E-03
4.08E-03
4.15E-03
4.15E-03
4.11E-03
4.06E-03
4.22E-03
30
4.29E-03
4.09E-03
4.02E-03
3.90E-03
3.94E-03
4.21E-03
4.26E-03
4.14E-03
3.97E-03
4.19E-03
4.11E-03
50
4.37E-03
4.12E-03
3.88E-03
3.99E-03
4.05E-03
4.32E-03
4.36E-03
4.27E-03
4.14E-03
4.24E-03
4.14E-03
60
4.19E-03
4.16E-03
4.02E-03
4.01E-03
4.11E-03
4.16E-03
4.22E-03
4.19E-03
4.21E-03
4.12E-03
4.19E-03
70
4.07E-03
4.02E-03
3.92E-03
3.88E-03
4.03E-03
4.05E-03
4.29E-03
4.08E-03
3.93E-03
4.13E-03
4.18E-03
4.00E-03
1.41E-04
4.39E-03
3.62E-03
4.01E-03
1.51E-04
4.42E-03
3.59E-03
4.08E-03
1.31E-04
4.43E-03
3.72E-03
4.05E-03
1.54E-04
4.47E-03
3.63E-03
4.08E-03
1.83E-04
4.59E-03
3.58E-03
4.10E-03
8.11E-05
4.32E-03
3.88E-03
3.98E-03
8.02E-05
4.20E-03
3.76E-03
3.99E-03
1.33E-04
4.36E-03
3.63E-03
1.00E-02
PASS
4.02E-03
1.55E-04
4.45E-03
3.60E-03
2.00E-02
PASS
4.11E-03
4.06E-05
4.22E-03
4.00E-03
2.00E-02
PASS
4.15E-03
1.11E-04
4.46E-03
3.85E-03
2.00E-02
PASS
4.27E-03
8.41E-05
4.50E-03
4.04E-03
2.00E-02
PASS
4.18E-03
4.06E-05
4.29E-03
4.07E-03
2.00E-02
PASS
4.10E-03
1.31E-04
4.46E-03
3.74E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
482
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.238. Plot of Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
483
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.238. Raw data for Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.03E-03
4.22E-03
3.91E-03
3.97E-03
3.88E-03
4.02E-03
3.91E-03
4.00E-03
3.83E-03
4.05E-03
3.91E-03
10
3.95E-03
4.10E-03
3.85E-03
3.93E-03
4.00E-03
3.95E-03
4.04E-03
4.12E-03
3.85E-03
4.10E-03
4.09E-03
20
4.11E-03
4.05E-03
4.00E-03
4.01E-03
4.11E-03
4.10E-03
4.18E-03
4.08E-03
4.00E-03
4.06E-03
3.93E-03
30
4.02E-03
4.16E-03
3.95E-03
4.19E-03
4.04E-03
4.12E-03
4.27E-03
4.24E-03
4.11E-03
4.22E-03
3.99E-03
50
4.02E-03
4.19E-03
4.12E-03
4.07E-03
4.12E-03
3.97E-03
4.24E-03
4.17E-03
4.20E-03
4.24E-03
4.04E-03
60
4.31E-03
4.19E-03
4.07E-03
4.17E-03
4.06E-03
4.16E-03
4.27E-03
4.26E-03
4.16E-03
4.26E-03
4.09E-03
70
3.98E-03
4.08E-03
3.73E-03
3.97E-03
3.85E-03
4.07E-03
4.24E-03
4.22E-03
4.02E-03
4.25E-03
4.03E-03
4.00E-03
1.35E-04
4.37E-03
3.63E-03
3.97E-03
9.24E-05
4.22E-03
3.71E-03
4.06E-03
5.27E-05
4.20E-03
3.91E-03
4.07E-03
1.00E-04
4.35E-03
3.80E-03
4.10E-03
6.35E-05
4.28E-03
3.93E-03
4.16E-03
1.02E-04
4.44E-03
3.88E-03
3.92E-03
1.35E-04
4.29E-03
3.55E-03
3.96E-03
9.04E-05
4.21E-03
3.71E-03
1.00E-02
PASS
4.01E-03
1.12E-04
4.32E-03
3.70E-03
2.00E-02
PASS
4.08E-03
6.54E-05
4.26E-03
3.90E-03
2.00E-02
PASS
4.19E-03
7.26E-05
4.39E-03
3.99E-03
2.00E-02
PASS
4.16E-03
1.12E-04
4.47E-03
3.86E-03
2.00E-02
PASS
4.22E-03
5.67E-05
4.38E-03
4.07E-03
2.00E-02
PASS
4.16E-03
1.07E-04
4.45E-03
3.87E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
484
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.239. Plot of Output Voltage Swing High IL= 0mA @ 5V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
485
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.239. Raw data for Output Voltage Swing High IL= 0mA @ 5V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.97E-03
4.20E-03
3.93E-03
4.10E-03
4.02E-03
3.90E-03
4.03E-03
3.93E-03
3.93E-03
4.08E-03
3.98E-03
10
3.98E-03
4.05E-03
3.85E-03
4.08E-03
3.95E-03
3.90E-03
4.05E-03
4.05E-03
3.78E-03
4.10E-03
3.95E-03
20
4.08E-03
4.15E-03
3.93E-03
4.13E-03
3.96E-03
4.05E-03
4.20E-03
4.18E-03
4.05E-03
4.11E-03
4.05E-03
30
4.14E-03
4.26E-03
3.95E-03
4.05E-03
3.99E-03
4.07E-03
4.17E-03
4.05E-03
4.00E-03
4.21E-03
4.04E-03
50
4.07E-03
4.17E-03
3.88E-03
3.99E-03
3.95E-03
4.22E-03
4.00E-03
4.22E-03
4.09E-03
4.24E-03
4.00E-03
60
4.17E-03
4.27E-03
4.01E-03
4.16E-03
4.16E-03
4.12E-03
4.14E-03
4.22E-03
4.06E-03
4.21E-03
4.09E-03
70
3.93E-03
4.24E-03
3.81E-03
4.08E-03
3.85E-03
4.29E-03
4.17E-03
4.19E-03
4.12E-03
4.08E-03
4.06E-03
4.04E-03
1.08E-04
4.34E-03
3.75E-03
3.98E-03
9.04E-05
4.23E-03
3.73E-03
4.05E-03
9.97E-05
4.32E-03
3.78E-03
4.08E-03
1.24E-04
4.42E-03
3.74E-03
4.01E-03
1.12E-04
4.32E-03
3.71E-03
4.15E-03
9.29E-05
4.41E-03
3.90E-03
3.98E-03
1.77E-04
4.47E-03
3.50E-03
3.97E-03
7.70E-05
4.19E-03
3.76E-03
1.00E-02
PASS
3.98E-03
1.33E-04
4.34E-03
3.61E-03
2.00E-02
PASS
4.12E-03
7.05E-05
4.31E-03
3.92E-03
2.00E-02
PASS
4.10E-03
8.72E-05
4.34E-03
3.86E-03
2.00E-02
PASS
4.15E-03
1.05E-04
4.44E-03
3.87E-03
2.00E-02
PASS
4.15E-03
6.63E-05
4.33E-03
3.97E-03
2.00E-02
PASS
4.17E-03
7.97E-05
4.39E-03
3.95E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
486
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 0mA @ 5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.240. Plot of Output Voltage Swing High IL= 0mA @ 5V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
487
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.240. Raw data for Output Voltage Swing High IL= 0mA @ 5V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 0mA @ 5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
4.07E-03
4.03E-03
3.86E-03
3.98E-03
4.02E-03
4.03E-03
4.07E-03
4.00E-03
3.76E-03
4.01E-03
4.20E-03
10
4.24E-03
4.15E-03
3.88E-03
3.88E-03
4.05E-03
4.18E-03
4.09E-03
4.14E-03
3.77E-03
4.07E-03
4.07E-03
20
4.27E-03
3.88E-03
3.91E-03
3.98E-03
4.08E-03
4.22E-03
3.95E-03
4.20E-03
4.03E-03
4.17E-03
4.17E-03
30
4.24E-03
4.11E-03
4.02E-03
3.99E-03
4.14E-03
4.27E-03
4.09E-03
4.32E-03
3.94E-03
4.29E-03
4.24E-03
50
4.37E-03
4.32E-03
4.12E-03
4.09E-03
4.19E-03
4.36E-03
4.20E-03
4.20E-03
4.04E-03
4.20E-03
4.22E-03
60
4.36E-03
4.16E-03
3.99E-03
4.24E-03
4.26E-03
4.27E-03
4.21E-03
4.36E-03
4.11E-03
4.36E-03
4.17E-03
70
4.17E-03
3.95E-03
3.98E-03
3.81E-03
4.00E-03
4.20E-03
4.13E-03
4.19E-03
4.00E-03
4.15E-03
4.25E-03
3.99E-03
8.04E-05
4.21E-03
3.77E-03
4.04E-03
1.61E-04
4.48E-03
3.60E-03
4.02E-03
1.58E-04
4.46E-03
3.59E-03
4.10E-03
9.97E-05
4.37E-03
3.83E-03
4.22E-03
1.23E-04
4.55E-03
3.88E-03
4.20E-03
1.38E-04
4.58E-03
3.82E-03
3.98E-03
1.29E-04
4.33E-03
3.63E-03
3.97E-03
1.23E-04
4.31E-03
3.64E-03
1.00E-02
PASS
4.05E-03
1.62E-04
4.50E-03
3.60E-03
2.00E-02
PASS
4.11E-03
1.18E-04
4.44E-03
3.79E-03
2.00E-02
PASS
4.18E-03
1.62E-04
4.63E-03
3.74E-03
2.00E-02
PASS
4.20E-03
1.13E-04
4.51E-03
3.89E-03
2.00E-02
PASS
4.26E-03
1.06E-04
4.55E-03
3.97E-03
2.00E-02
PASS
4.13E-03
8.02E-05
4.35E-03
3.91E-03
2.00E-02
PASS
An ISO 9001:2000 Certified Company
488
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.241. Plot of Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
489
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.241. Raw data for Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.03E-02
6.85E-02
6.85E-02
6.79E-02
6.85E-02
7.02E-02
6.85E-02
6.87E-02
6.80E-02
6.96E-02
6.95E-02
10
7.20E-02
6.93E-02
6.95E-02
6.88E-02
6.95E-02
7.06E-02
6.87E-02
6.94E-02
6.83E-02
7.03E-02
6.92E-02
20
7.29E-02
6.98E-02
7.03E-02
6.93E-02
7.01E-02
7.09E-02
6.92E-02
6.95E-02
6.86E-02
7.05E-02
6.93E-02
30
7.33E-02
7.03E-02
7.07E-02
6.99E-02
7.06E-02
7.13E-02
6.94E-02
6.99E-02
6.90E-02
7.08E-02
6.95E-02
50
7.44E-02
7.11E-02
7.10E-02
7.04E-02
7.12E-02
7.19E-02
6.98E-02
7.06E-02
6.98E-02
7.10E-02
6.96E-02
60
7.44E-02
7.11E-02
7.13E-02
7.07E-02
7.15E-02
7.19E-02
7.03E-02
7.07E-02
6.98E-02
7.13E-02
6.96E-02
70
7.27E-02
6.99E-02
7.02E-02
6.94E-02
7.03E-02
7.14E-02
6.96E-02
7.00E-02
6.90E-02
7.10E-02
6.94E-02
6.87E-02
9.27E-04
7.13E-02
6.62E-02
6.98E-02
1.25E-03
7.32E-02
6.64E-02
7.05E-02
1.40E-03
7.43E-02
6.66E-02
7.10E-02
1.34E-03
7.46E-02
6.73E-02
7.16E-02
1.56E-03
7.59E-02
6.73E-02
7.18E-02
1.51E-03
7.59E-02
6.77E-02
7.05E-02
1.28E-03
7.40E-02
6.70E-02
6.90E-02
8.74E-04
7.14E-02
6.66E-02
1.50E-01
PASS
6.95E-02
9.83E-04
7.22E-02
6.68E-02
1.50E-01
PASS
6.97E-02
9.49E-04
7.23E-02
6.71E-02
1.50E-01
PASS
7.01E-02
9.26E-04
7.26E-02
6.75E-02
1.50E-01
PASS
7.06E-02
8.81E-04
7.31E-02
6.82E-02
1.50E-01
PASS
7.08E-02
8.34E-04
7.31E-02
6.85E-02
1.50E-01
PASS
7.02E-02
1.02E-03
7.30E-02
6.74E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
490
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.242. Plot of Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
491
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.242. Raw data for Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.86E-02
6.95E-02
6.59E-02
6.99E-02
6.69E-02
6.83E-02
6.88E-02
6.62E-02
6.75E-02
6.89E-02
6.85E-02
10
7.02E-02
7.08E-02
6.69E-02
7.09E-02
6.77E-02
6.86E-02
6.93E-02
6.68E-02
6.80E-02
6.93E-02
6.83E-02
20
7.08E-02
7.14E-02
6.72E-02
7.17E-02
6.84E-02
6.89E-02
6.96E-02
6.71E-02
6.83E-02
6.98E-02
6.83E-02
30
7.15E-02
7.19E-02
6.80E-02
7.22E-02
6.89E-02
6.94E-02
7.01E-02
6.75E-02
6.86E-02
7.00E-02
6.84E-02
50
7.25E-02
7.26E-02
6.84E-02
7.31E-02
6.95E-02
7.00E-02
7.06E-02
6.79E-02
6.91E-02
7.06E-02
6.85E-02
60
7.26E-02
7.28E-02
6.88E-02
7.30E-02
6.97E-02
7.03E-02
7.04E-02
6.80E-02
6.92E-02
7.05E-02
6.84E-02
70
7.08E-02
7.14E-02
6.75E-02
7.20E-02
6.88E-02
6.93E-02
7.01E-02
6.75E-02
6.87E-02
7.03E-02
6.85E-02
6.82E-02
1.71E-03
7.28E-02
6.35E-02
6.93E-02
1.85E-03
7.44E-02
6.42E-02
6.99E-02
1.97E-03
7.53E-02
6.45E-02
7.05E-02
1.91E-03
7.57E-02
6.53E-02
7.12E-02
2.10E-03
7.70E-02
6.55E-02
7.13E-02
1.99E-03
7.68E-02
6.59E-02
7.01E-02
1.89E-03
7.53E-02
6.49E-02
6.80E-02
1.10E-03
7.10E-02
6.49E-02
1.50E-01
PASS
6.84E-02
1.07E-03
7.13E-02
6.55E-02
1.50E-01
PASS
6.87E-02
1.11E-03
7.18E-02
6.57E-02
1.50E-01
PASS
6.91E-02
1.07E-03
7.21E-02
6.62E-02
1.50E-01
PASS
6.96E-02
1.16E-03
7.28E-02
6.65E-02
1.50E-01
PASS
6.97E-02
1.09E-03
7.27E-02
6.67E-02
1.50E-01
PASS
6.92E-02
1.13E-03
7.23E-02
6.61E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
492
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.243. Plot of Output Voltage Swing High IL= 1mA @ 5V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
493
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.243. Raw data for Output Voltage Swing High IL= 1mA @ 5V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
6.84E-02
7.00E-02
6.58E-02
7.01E-02
6.72E-02
6.85E-02
6.84E-02
6.62E-02
6.80E-02
6.89E-02
6.85E-02
10
7.03E-02
7.11E-02
6.66E-02
7.08E-02
6.83E-02
6.88E-02
6.88E-02
6.68E-02
6.84E-02
6.94E-02
6.84E-02
20
7.10E-02
7.16E-02
6.71E-02
7.17E-02
6.90E-02
6.92E-02
6.92E-02
6.70E-02
6.85E-02
7.00E-02
6.84E-02
30
7.16E-02
7.22E-02
6.75E-02
7.20E-02
6.94E-02
6.95E-02
6.95E-02
6.76E-02
6.90E-02
7.02E-02
6.84E-02
50
7.25E-02
7.30E-02
6.82E-02
7.28E-02
7.03E-02
7.00E-02
7.03E-02
6.81E-02
6.96E-02
7.06E-02
6.87E-02
60
7.23E-02
7.29E-02
6.84E-02
7.30E-02
7.03E-02
7.03E-02
7.05E-02
6.81E-02
6.97E-02
7.09E-02
6.87E-02
70
7.10E-02
7.18E-02
6.75E-02
7.16E-02
6.92E-02
6.94E-02
6.96E-02
6.74E-02
6.91E-02
7.04E-02
6.86E-02
6.83E-02
1.83E-03
7.33E-02
6.33E-02
6.94E-02
1.91E-03
7.47E-02
6.42E-02
7.01E-02
1.98E-03
7.55E-02
6.46E-02
7.05E-02
2.03E-03
7.61E-02
6.50E-02
7.13E-02
2.07E-03
7.70E-02
6.57E-02
7.14E-02
2.00E-03
7.68E-02
6.59E-02
7.02E-02
1.85E-03
7.53E-02
6.51E-02
6.80E-02
1.06E-03
7.09E-02
6.51E-02
1.50E-01
PASS
6.84E-02
9.83E-04
7.11E-02
6.57E-02
1.50E-01
PASS
6.88E-02
1.14E-03
7.19E-02
6.57E-02
1.50E-01
PASS
6.92E-02
9.75E-04
7.18E-02
6.65E-02
1.50E-01
PASS
6.97E-02
9.98E-04
7.24E-02
6.70E-02
1.50E-01
PASS
6.99E-02
1.12E-03
7.30E-02
6.68E-02
1.50E-01
PASS
6.92E-02
1.11E-03
7.22E-02
6.61E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
494
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 1mA @ 5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.60E-01
1.40E-01
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.244. Plot of Output Voltage Swing High IL= 1mA @ 5V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
495
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.244. Raw data for Output Voltage Swing High IL= 1mA @ 5V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 1mA @ 5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.01E-02
6.79E-02
6.91E-02
6.78E-02
6.86E-02
7.01E-02
6.84E-02
6.90E-02
6.77E-02
6.96E-02
6.97E-02
10
7.17E-02
6.90E-02
7.00E-02
6.90E-02
6.99E-02
7.06E-02
6.88E-02
6.97E-02
6.80E-02
7.00E-02
6.95E-02
20
7.23E-02
6.96E-02
7.06E-02
6.93E-02
7.02E-02
7.09E-02
6.89E-02
6.98E-02
6.87E-02
7.03E-02
6.95E-02
30
7.29E-02
7.01E-02
7.11E-02
6.98E-02
7.08E-02
7.11E-02
6.94E-02
7.01E-02
6.88E-02
7.08E-02
6.96E-02
50
7.37E-02
7.07E-02
7.19E-02
7.06E-02
7.15E-02
7.17E-02
6.99E-02
7.06E-02
6.93E-02
7.11E-02
6.96E-02
60
7.37E-02
7.08E-02
7.17E-02
7.06E-02
7.17E-02
7.19E-02
7.00E-02
7.08E-02
6.94E-02
7.13E-02
6.95E-02
70
7.23E-02
6.96E-02
7.07E-02
6.94E-02
7.06E-02
7.13E-02
6.94E-02
7.03E-02
6.90E-02
7.06E-02
6.97E-02
6.87E-02
9.30E-04
7.12E-02
6.61E-02
6.99E-02
1.08E-03
7.29E-02
6.70E-02
7.04E-02
1.17E-03
7.36E-02
6.72E-02
7.09E-02
1.18E-03
7.42E-02
6.77E-02
7.17E-02
1.25E-03
7.51E-02
6.82E-02
7.17E-02
1.24E-03
7.51E-02
6.83E-02
7.05E-02
1.16E-03
7.37E-02
6.73E-02
6.90E-02
9.66E-04
7.16E-02
6.63E-02
1.50E-01
PASS
6.94E-02
1.05E-03
7.23E-02
6.66E-02
1.50E-01
PASS
6.97E-02
9.15E-04
7.22E-02
6.72E-02
1.50E-01
PASS
7.00E-02
9.73E-04
7.27E-02
6.74E-02
1.50E-01
PASS
7.05E-02
9.63E-04
7.32E-02
6.79E-02
1.50E-01
PASS
7.07E-02
1.01E-03
7.35E-02
6.79E-02
1.50E-01
PASS
7.01E-02
9.38E-04
7.27E-02
6.75E-02
1.50E-01
PASS
An ISO 9001:2000 Certified Company
496
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.245. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
497
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.245. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.25E-01
1.23E-01
1.24E-01
1.22E-01
1.23E-01
1.26E-01
1.23E-01
1.25E-01
1.23E-01
1.26E-01
1.25E-01
10
1.28E-01
1.24E-01
1.25E-01
1.23E-01
1.25E-01
1.26E-01
1.23E-01
1.25E-01
1.23E-01
1.26E-01
1.25E-01
20
1.28E-01
1.25E-01
1.26E-01
1.24E-01
1.25E-01
1.27E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.24E-01
30
1.29E-01
1.26E-01
1.27E-01
1.24E-01
1.26E-01
1.27E-01
1.24E-01
1.26E-01
1.24E-01
1.27E-01
1.25E-01
50
1.30E-01
1.27E-01
1.28E-01
1.26E-01
1.27E-01
1.28E-01
1.25E-01
1.26E-01
1.24E-01
1.27E-01
1.25E-01
60
1.31E-01
1.27E-01
1.28E-01
1.26E-01
1.27E-01
1.28E-01
1.25E-01
1.27E-01
1.25E-01
1.28E-01
1.25E-01
70
1.28E-01
1.25E-01
1.26E-01
1.24E-01
1.25E-01
1.28E-01
1.25E-01
1.26E-01
1.24E-01
1.27E-01
1.24E-01
1.24E-01
1.08E-03
1.27E-01
1.21E-01
1.25E-01
1.57E-03
1.29E-01
1.21E-01
1.26E-01
1.66E-03
1.30E-01
1.21E-01
1.26E-01
1.77E-03
1.31E-01
1.21E-01
1.27E-01
1.81E-03
1.32E-01
1.22E-01
1.28E-01
1.80E-03
1.33E-01
1.23E-01
1.26E-01
1.64E-03
1.30E-01
1.21E-01
1.24E-01
1.29E-03
1.28E-01
1.21E-01
2.50E-01
PASS
1.25E-01
1.38E-03
1.28E-01
1.21E-01
2.50E-01
PASS
1.25E-01
1.39E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.26E-01
1.44E-03
1.30E-01
1.22E-01
2.50E-01
PASS
1.26E-01
1.39E-03
1.30E-01
1.22E-01
2.50E-01
PASS
1.26E-01
1.37E-03
1.30E-01
1.23E-01
2.50E-01
PASS
1.26E-01
1.51E-03
1.30E-01
1.22E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
498
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.246. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
499
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.246. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.23E-01
1.25E-01
1.20E-01
1.25E-01
1.21E-01
1.23E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.24E-01
10
1.25E-01
1.27E-01
1.21E-01
1.27E-01
1.22E-01
1.24E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
20
1.25E-01
1.27E-01
1.22E-01
1.27E-01
1.23E-01
1.24E-01
1.25E-01
1.21E-01
1.23E-01
1.25E-01
1.23E-01
30
1.26E-01
1.28E-01
1.23E-01
1.28E-01
1.24E-01
1.25E-01
1.25E-01
1.22E-01
1.23E-01
1.26E-01
1.24E-01
50
1.28E-01
1.29E-01
1.23E-01
1.29E-01
1.24E-01
1.26E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.24E-01
60
1.28E-01
1.29E-01
1.23E-01
1.29E-01
1.25E-01
1.25E-01
1.26E-01
1.23E-01
1.24E-01
1.27E-01
1.24E-01
70
1.26E-01
1.27E-01
1.22E-01
1.27E-01
1.23E-01
1.25E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.23E-01
1.23E-01
2.36E-03
1.29E-01
1.16E-01
1.24E-01
2.55E-03
1.31E-01
1.17E-01
1.25E-01
2.58E-03
1.32E-01
1.18E-01
1.26E-01
2.45E-03
1.32E-01
1.19E-01
1.27E-01
2.64E-03
1.34E-01
1.19E-01
1.27E-01
2.72E-03
1.34E-01
1.19E-01
1.25E-01
2.37E-03
1.32E-01
1.19E-01
1.23E-01
1.62E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.23E-01
1.55E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.24E-01
1.66E-03
1.28E-01
1.19E-01
2.50E-01
PASS
1.24E-01
1.61E-03
1.29E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.58E-03
1.29E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.38E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.24E-01
1.58E-03
1.29E-01
1.20E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
500
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.247. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
501
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.247. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.23E-01
1.26E-01
1.20E-01
1.25E-01
1.22E-01
1.24E-01
1.24E-01
1.21E-01
1.23E-01
1.25E-01
1.24E-01
10
1.25E-01
1.27E-01
1.21E-01
1.26E-01
1.23E-01
1.24E-01
1.23E-01
1.21E-01
1.23E-01
1.25E-01
1.24E-01
20
1.26E-01
1.28E-01
1.21E-01
1.27E-01
1.23E-01
1.24E-01
1.24E-01
1.21E-01
1.24E-01
1.25E-01
1.24E-01
30
1.27E-01
1.28E-01
1.22E-01
1.28E-01
1.24E-01
1.25E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.24E-01
50
1.28E-01
1.29E-01
1.23E-01
1.29E-01
1.25E-01
1.25E-01
1.25E-01
1.22E-01
1.25E-01
1.26E-01
1.24E-01
60
1.28E-01
1.29E-01
1.23E-01
1.29E-01
1.25E-01
1.25E-01
1.25E-01
1.23E-01
1.25E-01
1.27E-01
1.24E-01
70
1.26E-01
1.28E-01
1.22E-01
1.27E-01
1.24E-01
1.25E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.24E-01
1.23E-01
2.35E-03
1.29E-01
1.17E-01
1.24E-01
2.62E-03
1.32E-01
1.17E-01
1.25E-01
2.60E-03
1.32E-01
1.18E-01
1.26E-01
2.58E-03
1.33E-01
1.19E-01
1.27E-01
2.69E-03
1.34E-01
1.19E-01
1.27E-01
2.75E-03
1.34E-01
1.19E-01
1.25E-01
2.45E-03
1.32E-01
1.19E-01
1.23E-01
1.50E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.23E-01
1.50E-03
1.27E-01
1.19E-01
2.50E-01
PASS
1.24E-01
1.44E-03
1.28E-01
1.20E-01
2.50E-01
PASS
1.24E-01
1.46E-03
1.28E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.56E-03
1.29E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.37E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.24E-01
1.60E-03
1.29E-01
1.20E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
502
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing High IL= 2.5mA @ 5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
3.00E-01
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.248. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
503
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.248. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing High IL= 2.5mA @ 5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.25E-01
1.23E-01
1.25E-01
1.22E-01
1.24E-01
1.26E-01
1.23E-01
1.25E-01
1.22E-01
1.26E-01
1.25E-01
10
1.27E-01
1.24E-01
1.26E-01
1.23E-01
1.25E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.25E-01
20
1.28E-01
1.25E-01
1.26E-01
1.24E-01
1.25E-01
1.26E-01
1.24E-01
1.25E-01
1.23E-01
1.26E-01
1.25E-01
30
1.29E-01
1.25E-01
1.27E-01
1.25E-01
1.26E-01
1.27E-01
1.24E-01
1.26E-01
1.24E-01
1.27E-01
1.25E-01
50
1.30E-01
1.27E-01
1.28E-01
1.26E-01
1.27E-01
1.28E-01
1.25E-01
1.27E-01
1.24E-01
1.27E-01
1.25E-01
60
1.30E-01
1.27E-01
1.28E-01
1.26E-01
1.27E-01
1.28E-01
1.26E-01
1.27E-01
1.25E-01
1.28E-01
1.25E-01
70
1.28E-01
1.25E-01
1.27E-01
1.24E-01
1.26E-01
1.27E-01
1.25E-01
1.26E-01
1.24E-01
1.27E-01
1.25E-01
1.24E-01
1.23E-03
1.27E-01
1.20E-01
1.25E-01
1.56E-03
1.29E-01
1.21E-01
1.26E-01
1.59E-03
1.30E-01
1.21E-01
1.26E-01
1.57E-03
1.31E-01
1.22E-01
1.27E-01
1.63E-03
1.32E-01
1.23E-01
1.28E-01
1.58E-03
1.32E-01
1.23E-01
1.26E-01
1.53E-03
1.30E-01
1.22E-01
1.24E-01
1.49E-03
1.28E-01
1.20E-01
2.50E-01
PASS
1.25E-01
1.41E-03
1.28E-01
1.21E-01
2.50E-01
PASS
1.25E-01
1.44E-03
1.29E-01
1.21E-01
2.50E-01
PASS
1.26E-01
1.54E-03
1.30E-01
1.21E-01
2.50E-01
PASS
1.26E-01
1.42E-03
1.30E-01
1.22E-01
2.50E-01
PASS
1.27E-01
1.50E-03
1.31E-01
1.23E-01
2.50E-01
PASS
1.26E-01
1.38E-03
1.30E-01
1.22E-01
2.50E-01
PASS
An ISO 9001:2000 Certified Company
504
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.249. Plot of Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
505
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.249. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.51E-02
1.50E-02
1.48E-02
1.53E-02
1.49E-02
1.51E-02
1.48E-02
1.47E-02
1.49E-02
1.50E-02
1.48E-02
10
1.53E-02
1.52E-02
1.50E-02
1.55E-02
1.53E-02
1.50E-02
1.49E-02
1.48E-02
1.50E-02
1.52E-02
1.48E-02
20
1.53E-02
1.53E-02
1.50E-02
1.55E-02
1.53E-02
1.53E-02
1.52E-02
1.51E-02
1.52E-02
1.53E-02
1.49E-02
30
1.56E-02
1.55E-02
1.53E-02
1.58E-02
1.56E-02
1.55E-02
1.53E-02
1.52E-02
1.54E-02
1.54E-02
1.48E-02
50
1.57E-02
1.57E-02
1.54E-02
1.60E-02
1.57E-02
1.57E-02
1.56E-02
1.53E-02
1.57E-02
1.55E-02
1.50E-02
60
1.57E-02
1.56E-02
1.54E-02
1.59E-02
1.56E-02
1.57E-02
1.56E-02
1.54E-02
1.56E-02
1.56E-02
1.49E-02
70
1.54E-02
1.55E-02
1.53E-02
1.57E-02
1.54E-02
1.54E-02
1.52E-02
1.51E-02
1.53E-02
1.54E-02
1.50E-02
1.50E-02
1.76E-04
1.55E-02
1.45E-02
1.53E-02
1.57E-04
1.57E-02
1.48E-02
1.53E-02
1.73E-04
1.58E-02
1.48E-02
1.55E-02
2.12E-04
1.61E-02
1.50E-02
1.57E-02
2.09E-04
1.63E-02
1.51E-02
1.57E-02
1.86E-04
1.62E-02
1.51E-02
1.54E-02
1.90E-04
1.60E-02
1.49E-02
1.49E-02
1.66E-04
1.54E-02
1.45E-02
3.00E-02
PASS
1.50E-02
1.33E-04
1.53E-02
1.46E-02
6.00E-02
PASS
1.52E-02
1.03E-04
1.55E-02
1.49E-02
6.00E-02
PASS
1.53E-02
1.28E-04
1.57E-02
1.50E-02
6.00E-02
PASS
1.56E-02
1.67E-04
1.60E-02
1.51E-02
6.00E-02
PASS
1.56E-02
1.18E-04
1.59E-02
1.53E-02
6.00E-02
PASS
1.53E-02
1.50E-04
1.57E-02
1.49E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
506
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.250. Plot of Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
507
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.250. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.54E-02
1.54E-02
1.54E-02
1.52E-02
1.54E-02
1.51E-02
1.56E-02
1.52E-02
1.52E-02
1.49E-02
1.52E-02
10
1.56E-02
1.58E-02
1.55E-02
1.56E-02
1.56E-02
1.51E-02
1.55E-02
1.54E-02
1.52E-02
1.48E-02
1.51E-02
20
1.59E-02
1.59E-02
1.56E-02
1.57E-02
1.58E-02
1.53E-02
1.58E-02
1.55E-02
1.54E-02
1.50E-02
1.51E-02
30
1.60E-02
1.60E-02
1.57E-02
1.59E-02
1.59E-02
1.54E-02
1.59E-02
1.57E-02
1.56E-02
1.50E-02
1.52E-02
50
1.64E-02
1.63E-02
1.60E-02
1.61E-02
1.61E-02
1.56E-02
1.62E-02
1.58E-02
1.59E-02
1.53E-02
1.52E-02
60
1.63E-02
1.64E-02
1.60E-02
1.62E-02
1.62E-02
1.58E-02
1.62E-02
1.59E-02
1.61E-02
1.52E-02
1.51E-02
70
1.59E-02
1.59E-02
1.57E-02
1.58E-02
1.58E-02
1.53E-02
1.58E-02
1.56E-02
1.56E-02
1.50E-02
1.51E-02
1.53E-02
6.69E-05
1.55E-02
1.52E-02
1.56E-02
1.03E-04
1.59E-02
1.53E-02
1.58E-02
1.39E-04
1.62E-02
1.54E-02
1.59E-02
1.18E-04
1.62E-02
1.56E-02
1.62E-02
1.40E-04
1.66E-02
1.58E-02
1.62E-02
1.56E-04
1.66E-02
1.58E-02
1.58E-02
1.03E-04
1.61E-02
1.55E-02
1.52E-02
2.68E-04
1.59E-02
1.44E-02
3.00E-02
PASS
1.52E-02
2.73E-04
1.60E-02
1.45E-02
6.00E-02
PASS
1.54E-02
2.94E-04
1.62E-02
1.46E-02
6.00E-02
PASS
1.55E-02
3.11E-04
1.64E-02
1.47E-02
6.00E-02
PASS
1.58E-02
3.23E-04
1.67E-02
1.49E-02
6.00E-02
PASS
1.58E-02
3.83E-04
1.69E-02
1.48E-02
6.00E-02
PASS
1.55E-02
2.99E-04
1.63E-02
1.46E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
508
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.251. Plot of Output Voltage Swing Low IL= 0mA @ 5V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
509
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.251. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.51E-02
1.48E-02
1.50E-02
1.50E-02
1.49E-02
1.47E-02
1.51E-02
1.52E-02
1.51E-02
1.47E-02
1.48E-02
10
1.53E-02
1.52E-02
1.52E-02
1.54E-02
1.55E-02
1.47E-02
1.52E-02
1.53E-02
1.52E-02
1.48E-02
1.46E-02
20
1.53E-02
1.54E-02
1.53E-02
1.55E-02
1.57E-02
1.49E-02
1.56E-02
1.54E-02
1.54E-02
1.50E-02
1.47E-02
30
1.57E-02
1.55E-02
1.56E-02
1.54E-02
1.58E-02
1.51E-02
1.57E-02
1.55E-02
1.54E-02
1.52E-02
1.46E-02
50
1.58E-02
1.56E-02
1.57E-02
1.58E-02
1.59E-02
1.53E-02
1.58E-02
1.57E-02
1.58E-02
1.54E-02
1.46E-02
60
1.59E-02
1.58E-02
1.58E-02
1.60E-02
1.60E-02
1.53E-02
1.59E-02
1.58E-02
1.58E-02
1.55E-02
1.47E-02
70
1.56E-02
1.54E-02
1.55E-02
1.56E-02
1.58E-02
1.51E-02
1.56E-02
1.55E-02
1.55E-02
1.51E-02
1.46E-02
1.49E-02
1.17E-04
1.53E-02
1.46E-02
1.53E-02
1.14E-04
1.56E-02
1.50E-02
1.54E-02
1.61E-04
1.59E-02
1.50E-02
1.56E-02
1.55E-04
1.60E-02
1.52E-02
1.58E-02
1.20E-04
1.61E-02
1.55E-02
1.59E-02
1.23E-04
1.62E-02
1.56E-02
1.56E-02
1.43E-04
1.60E-02
1.52E-02
1.50E-02
2.40E-04
1.56E-02
1.43E-02
3.00E-02
PASS
1.51E-02
2.54E-04
1.58E-02
1.44E-02
6.00E-02
PASS
1.53E-02
2.94E-04
1.61E-02
1.44E-02
6.00E-02
PASS
1.54E-02
2.41E-04
1.60E-02
1.47E-02
6.00E-02
PASS
1.56E-02
2.35E-04
1.63E-02
1.50E-02
6.00E-02
PASS
1.56E-02
2.34E-04
1.63E-02
1.50E-02
6.00E-02
PASS
1.54E-02
2.28E-04
1.60E-02
1.47E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
510
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 0mA @ 5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
7.00E-02
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.252. Plot of Output Voltage Swing Low IL= 0mA @ 5V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
511
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.252. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 0mA @ 5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
1.52E-02
1.49E-02
1.51E-02
1.56E-02
1.52E-02
1.51E-02
1.52E-02
1.50E-02
1.52E-02
1.52E-02
1.53E-02
10
1.54E-02
1.54E-02
1.55E-02
1.58E-02
1.56E-02
1.52E-02
1.53E-02
1.51E-02
1.54E-02
1.54E-02
1.51E-02
20
1.54E-02
1.54E-02
1.56E-02
1.59E-02
1.57E-02
1.54E-02
1.52E-02
1.53E-02
1.55E-02
1.53E-02
1.52E-02
30
1.56E-02
1.56E-02
1.58E-02
1.60E-02
1.58E-02
1.56E-02
1.55E-02
1.55E-02
1.58E-02
1.57E-02
1.52E-02
50
1.58E-02
1.59E-02
1.59E-02
1.62E-02
1.60E-02
1.58E-02
1.56E-02
1.57E-02
1.58E-02
1.58E-02
1.52E-02
60
1.58E-02
1.59E-02
1.59E-02
1.64E-02
1.60E-02
1.58E-02
1.58E-02
1.55E-02
1.59E-02
1.58E-02
1.53E-02
70
1.56E-02
1.55E-02
1.57E-02
1.60E-02
1.58E-02
1.56E-02
1.54E-02
1.54E-02
1.58E-02
1.55E-02
1.52E-02
1.52E-02
2.67E-04
1.59E-02
1.45E-02
1.55E-02
1.74E-04
1.60E-02
1.51E-02
1.56E-02
2.20E-04
1.62E-02
1.50E-02
1.57E-02
1.88E-04
1.62E-02
1.52E-02
1.60E-02
1.58E-04
1.64E-02
1.56E-02
1.60E-02
2.12E-04
1.66E-02
1.54E-02
1.57E-02
2.08E-04
1.63E-02
1.52E-02
1.52E-02
9.90E-05
1.54E-02
1.49E-02
3.00E-02
PASS
1.53E-02
1.28E-04
1.56E-02
1.49E-02
6.00E-02
PASS
1.54E-02
1.28E-04
1.57E-02
1.50E-02
6.00E-02
PASS
1.56E-02
1.26E-04
1.60E-02
1.53E-02
6.00E-02
PASS
1.57E-02
8.04E-05
1.60E-02
1.55E-02
6.00E-02
PASS
1.58E-02
1.33E-04
1.61E-02
1.54E-02
6.00E-02
PASS
1.56E-02
1.53E-04
1.60E-02
1.51E-02
6.00E-02
PASS
An ISO 9001:2000 Certified Company
512
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.253. Plot of Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
513
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.253. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.41E-02
3.43E-02
3.41E-02
3.43E-02
3.39E-02
3.40E-02
3.38E-02
3.40E-02
3.42E-02
3.42E-02
3.38E-02
10
3.43E-02
3.46E-02
3.44E-02
3.46E-02
3.44E-02
3.41E-02
3.39E-02
3.39E-02
3.43E-02
3.43E-02
3.36E-02
20
3.47E-02
3.47E-02
3.46E-02
3.49E-02
3.46E-02
3.43E-02
3.40E-02
3.40E-02
3.45E-02
3.45E-02
3.38E-02
30
3.48E-02
3.48E-02
3.48E-02
3.50E-02
3.48E-02
3.46E-02
3.42E-02
3.40E-02
3.48E-02
3.48E-02
3.37E-02
50
3.53E-02
3.54E-02
3.52E-02
3.53E-02
3.49E-02
3.47E-02
3.44E-02
3.46E-02
3.49E-02
3.48E-02
3.38E-02
60
3.53E-02
3.54E-02
3.51E-02
3.54E-02
3.51E-02
3.49E-02
3.44E-02
3.45E-02
3.50E-02
3.50E-02
3.38E-02
70
3.49E-02
3.49E-02
3.47E-02
3.49E-02
3.47E-02
3.46E-02
3.43E-02
3.42E-02
3.48E-02
3.46E-02
3.36E-02
3.41E-02
1.73E-04
3.46E-02
3.36E-02
3.45E-02
1.16E-04
3.48E-02
3.41E-02
3.47E-02
1.34E-04
3.51E-02
3.43E-02
3.48E-02
9.88E-05
3.51E-02
3.46E-02
3.52E-02
1.77E-04
3.57E-02
3.47E-02
3.53E-02
1.39E-04
3.56E-02
3.49E-02
3.48E-02
8.44E-05
3.50E-02
3.46E-02
3.40E-02
1.81E-04
3.45E-02
3.35E-02
1.00E-01
PASS
3.41E-02
2.04E-04
3.47E-02
3.36E-02
1.00E-01
PASS
3.43E-02
2.49E-04
3.49E-02
3.36E-02
1.00E-01
PASS
3.45E-02
3.42E-04
3.54E-02
3.36E-02
1.00E-01
PASS
3.47E-02
2.02E-04
3.53E-02
3.41E-02
1.00E-01
PASS
3.48E-02
3.05E-04
3.56E-02
3.39E-02
1.00E-01
PASS
3.45E-02
2.58E-04
3.52E-02
3.38E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
514
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.254. Plot of Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
515
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.254. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.47E-02
3.46E-02
3.40E-02
3.48E-02
3.43E-02
3.43E-02
3.46E-02
3.40E-02
3.43E-02
3.39E-02
3.46E-02
10
3.51E-02
3.49E-02
3.44E-02
3.52E-02
3.48E-02
3.43E-02
3.47E-02
3.40E-02
3.44E-02
3.40E-02
3.44E-02
20
3.53E-02
3.53E-02
3.45E-02
3.53E-02
3.50E-02
3.45E-02
3.50E-02
3.41E-02
3.45E-02
3.41E-02
3.43E-02
30
3.57E-02
3.53E-02
3.48E-02
3.56E-02
3.54E-02
3.46E-02
3.50E-02
3.44E-02
3.48E-02
3.42E-02
3.44E-02
50
3.60E-02
3.57E-02
3.52E-02
3.60E-02
3.56E-02
3.48E-02
3.54E-02
3.47E-02
3.50E-02
3.48E-02
3.45E-02
60
3.63E-02
3.58E-02
3.53E-02
3.59E-02
3.58E-02
3.51E-02
3.53E-02
3.46E-02
3.52E-02
3.47E-02
3.45E-02
70
3.55E-02
3.53E-02
3.46E-02
3.55E-02
3.53E-02
3.48E-02
3.53E-02
3.44E-02
3.47E-02
3.43E-02
3.45E-02
3.45E-02
3.28E-04
3.54E-02
3.36E-02
3.49E-02
3.04E-04
3.57E-02
3.40E-02
3.51E-02
3.72E-04
3.61E-02
3.41E-02
3.53E-02
3.41E-04
3.63E-02
3.44E-02
3.57E-02
3.46E-04
3.67E-02
3.48E-02
3.58E-02
3.37E-04
3.67E-02
3.49E-02
3.52E-02
3.47E-04
3.62E-02
3.43E-02
3.42E-02
2.78E-04
3.50E-02
3.35E-02
1.00E-01
PASS
3.43E-02
2.99E-04
3.51E-02
3.35E-02
1.00E-01
PASS
3.45E-02
3.87E-04
3.55E-02
3.34E-02
1.00E-01
PASS
3.46E-02
3.04E-04
3.54E-02
3.38E-02
1.00E-01
PASS
3.49E-02
2.75E-04
3.57E-02
3.42E-02
1.00E-01
PASS
3.50E-02
3.35E-04
3.59E-02
3.41E-02
1.00E-01
PASS
3.47E-02
4.02E-04
3.58E-02
3.36E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
516
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.255. Plot of Output Voltage Swing Low IL= 1mA @ 5V #3 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
517
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.255. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.45E-02
3.40E-02
3.37E-02
3.44E-02
3.41E-02
3.40E-02
3.44E-02
3.37E-02
3.43E-02
3.37E-02
3.38E-02
10
3.48E-02
3.45E-02
3.40E-02
3.47E-02
3.46E-02
3.41E-02
3.43E-02
3.39E-02
3.43E-02
3.37E-02
3.38E-02
20
3.52E-02
3.47E-02
3.41E-02
3.49E-02
3.46E-02
3.41E-02
3.45E-02
3.41E-02
3.44E-02
3.40E-02
3.38E-02
30
3.51E-02
3.49E-02
3.45E-02
3.52E-02
3.48E-02
3.42E-02
3.46E-02
3.43E-02
3.46E-02
3.41E-02
3.37E-02
50
3.57E-02
3.52E-02
3.48E-02
3.55E-02
3.53E-02
3.45E-02
3.49E-02
3.44E-02
3.50E-02
3.44E-02
3.38E-02
60
3.57E-02
3.51E-02
3.49E-02
3.56E-02
3.55E-02
3.45E-02
3.50E-02
3.45E-02
3.50E-02
3.45E-02
3.39E-02
70
3.53E-02
3.47E-02
3.41E-02
3.51E-02
3.49E-02
3.44E-02
3.45E-02
3.43E-02
3.48E-02
3.42E-02
3.37E-02
3.41E-02
3.07E-04
3.50E-02
3.33E-02
3.45E-02
2.88E-04
3.53E-02
3.37E-02
3.47E-02
3.89E-04
3.58E-02
3.36E-02
3.49E-02
2.74E-04
3.57E-02
3.41E-02
3.53E-02
3.11E-04
3.62E-02
3.45E-02
3.54E-02
3.26E-04
3.62E-02
3.45E-02
3.48E-02
4.51E-04
3.60E-02
3.36E-02
3.40E-02
2.91E-04
3.48E-02
3.32E-02
1.00E-01
PASS
3.41E-02
2.78E-04
3.48E-02
3.33E-02
1.00E-01
PASS
3.42E-02
2.34E-04
3.49E-02
3.36E-02
1.00E-01
PASS
3.44E-02
2.32E-04
3.50E-02
3.37E-02
1.00E-01
PASS
3.46E-02
3.01E-04
3.55E-02
3.38E-02
1.00E-01
PASS
3.47E-02
2.74E-04
3.55E-02
3.40E-02
1.00E-01
PASS
3.44E-02
2.19E-04
3.50E-02
3.38E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
518
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 1mA @ 5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-01
1.00E-01
8.00E-02
6.00E-02
4.00E-02
2.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.256. Plot of Output Voltage Swing Low IL= 1mA @ 5V #4 (V) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
519
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.256. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 1mA @ 5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
3.44E-02
3.44E-02
3.47E-02
3.48E-02
3.43E-02
3.45E-02
3.40E-02
3.41E-02
3.47E-02
3.45E-02
3.42E-02
10
3.48E-02
3.47E-02
3.49E-02
3.50E-02
3.47E-02
3.46E-02
3.42E-02
3.43E-02
3.48E-02
3.45E-02
3.40E-02
20
3.50E-02
3.49E-02
3.51E-02
3.53E-02
3.49E-02
3.47E-02
3.44E-02
3.43E-02
3.52E-02
3.47E-02
3.41E-02
30
3.52E-02
3.51E-02
3.52E-02
3.53E-02
3.50E-02
3.48E-02
3.45E-02
3.45E-02
3.52E-02
3.49E-02
3.40E-02
50
3.57E-02
3.53E-02
3.57E-02
3.57E-02
3.54E-02
3.52E-02
3.48E-02
3.47E-02
3.53E-02
3.51E-02
3.41E-02
60
3.57E-02
3.55E-02
3.56E-02
3.58E-02
3.56E-02
3.53E-02
3.50E-02
3.48E-02
3.55E-02
3.51E-02
3.43E-02
70
3.53E-02
3.49E-02
3.50E-02
3.52E-02
3.50E-02
3.48E-02
3.47E-02
3.45E-02
3.51E-02
3.49E-02
3.42E-02
3.45E-02
1.95E-04
3.50E-02
3.40E-02
3.48E-02
1.45E-04
3.52E-02
3.44E-02
3.50E-02
1.44E-04
3.54E-02
3.46E-02
3.51E-02
1.23E-04
3.55E-02
3.48E-02
3.55E-02
1.79E-04
3.60E-02
3.51E-02
3.56E-02
1.43E-04
3.60E-02
3.52E-02
3.51E-02
1.64E-04
3.55E-02
3.46E-02
3.44E-02
2.88E-04
3.52E-02
3.36E-02
1.00E-01
PASS
3.45E-02
2.35E-04
3.51E-02
3.38E-02
1.00E-01
PASS
3.47E-02
3.42E-04
3.56E-02
3.37E-02
1.00E-01
PASS
3.48E-02
2.64E-04
3.55E-02
3.40E-02
1.00E-01
PASS
3.50E-02
2.82E-04
3.58E-02
3.42E-02
1.00E-01
PASS
3.51E-02
2.35E-04
3.58E-02
3.45E-02
1.00E-01
PASS
3.48E-02
1.94E-04
3.53E-02
3.43E-02
1.00E-01
PASS
An ISO 9001:2000 Certified Company
520
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.257. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
521
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.257. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.34E-02
7.40E-02
7.38E-02
7.33E-02
7.34E-02
7.34E-02
7.34E-02
7.33E-02
7.38E-02
7.41E-02
7.27E-02
10
7.39E-02
7.45E-02
7.41E-02
7.36E-02
7.36E-02
7.33E-02
7.32E-02
7.37E-02
7.36E-02
7.39E-02
7.26E-02
20
7.45E-02
7.46E-02
7.46E-02
7.42E-02
7.38E-02
7.35E-02
7.32E-02
7.37E-02
7.37E-02
7.44E-02
7.25E-02
30
7.46E-02
7.50E-02
7.45E-02
7.46E-02
7.40E-02
7.41E-02
7.35E-02
7.38E-02
7.36E-02
7.44E-02
7.27E-02
50
7.49E-02
7.52E-02
7.53E-02
7.48E-02
7.44E-02
7.42E-02
7.37E-02
7.43E-02
7.43E-02
7.50E-02
7.28E-02
60
7.50E-02
7.53E-02
7.58E-02
7.51E-02
7.51E-02
7.45E-02
7.38E-02
7.45E-02
7.43E-02
7.48E-02
7.26E-02
70
7.43E-02
7.46E-02
7.49E-02
7.41E-02
7.40E-02
7.42E-02
7.37E-02
7.40E-02
7.43E-02
7.46E-02
7.27E-02
7.36E-02
2.79E-04
7.43E-02
7.28E-02
7.40E-02
3.61E-04
7.50E-02
7.30E-02
7.43E-02
3.21E-04
7.52E-02
7.35E-02
7.45E-02
3.82E-04
7.56E-02
7.35E-02
7.49E-02
3.48E-04
7.59E-02
7.40E-02
7.52E-02
3.43E-04
7.62E-02
7.43E-02
7.44E-02
3.75E-04
7.54E-02
7.33E-02
7.36E-02
3.60E-04
7.46E-02
7.26E-02
2.00E-01
PASS
7.35E-02
2.84E-04
7.43E-02
7.28E-02
2.00E-01
PASS
7.37E-02
4.59E-04
7.50E-02
7.24E-02
2.00E-01
PASS
7.39E-02
3.62E-04
7.49E-02
7.29E-02
2.00E-01
PASS
7.43E-02
4.56E-04
7.55E-02
7.30E-02
2.00E-01
PASS
7.44E-02
3.61E-04
7.54E-02
7.34E-02
2.00E-01
PASS
7.41E-02
3.15E-04
7.50E-02
7.33E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
522
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.258. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
523
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.258. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.44E-02
7.40E-02
7.30E-02
7.44E-02
7.37E-02
7.43E-02
7.41E-02
7.30E-02
7.39E-02
7.37E-02
7.43E-02
10
7.48E-02
7.47E-02
7.33E-02
7.47E-02
7.41E-02
7.43E-02
7.37E-02
7.33E-02
7.36E-02
7.36E-02
7.37E-02
20
7.49E-02
7.52E-02
7.38E-02
7.53E-02
7.47E-02
7.46E-02
7.43E-02
7.33E-02
7.40E-02
7.36E-02
7.39E-02
30
7.56E-02
7.49E-02
7.41E-02
7.57E-02
7.51E-02
7.48E-02
7.44E-02
7.38E-02
7.41E-02
7.39E-02
7.41E-02
50
7.63E-02
7.54E-02
7.46E-02
7.58E-02
7.53E-02
7.49E-02
7.49E-02
7.37E-02
7.45E-02
7.42E-02
7.43E-02
60
7.60E-02
7.58E-02
7.46E-02
7.61E-02
7.54E-02
7.50E-02
7.49E-02
7.43E-02
7.50E-02
7.48E-02
7.40E-02
70
7.52E-02
7.50E-02
7.39E-02
7.54E-02
7.49E-02
7.49E-02
7.45E-02
7.37E-02
7.42E-02
7.41E-02
7.43E-02
7.39E-02
5.98E-04
7.55E-02
7.23E-02
7.43E-02
6.41E-04
7.61E-02
7.26E-02
7.48E-02
5.67E-04
7.63E-02
7.32E-02
7.51E-02
6.27E-04
7.68E-02
7.34E-02
7.55E-02
6.17E-04
7.72E-02
7.38E-02
7.56E-02
6.07E-04
7.72E-02
7.39E-02
7.49E-02
5.78E-04
7.65E-02
7.33E-02
7.38E-02
5.01E-04
7.52E-02
7.24E-02
2.00E-01
PASS
7.37E-02
3.52E-04
7.46E-02
7.27E-02
2.00E-01
PASS
7.39E-02
5.44E-04
7.54E-02
7.24E-02
2.00E-01
PASS
7.42E-02
4.08E-04
7.53E-02
7.31E-02
2.00E-01
PASS
7.44E-02
4.99E-04
7.58E-02
7.31E-02
2.00E-01
PASS
7.48E-02
2.87E-04
7.56E-02
7.40E-02
2.00E-01
PASS
7.43E-02
4.39E-04
7.55E-02
7.31E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
524
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.259. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
525
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.259. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.37E-02
7.33E-02
7.27E-02
7.36E-02
7.31E-02
7.36E-02
7.35E-02
7.27E-02
7.35E-02
7.28E-02
7.35E-02
10
7.41E-02
7.41E-02
7.30E-02
7.39E-02
7.35E-02
7.34E-02
7.34E-02
7.27E-02
7.38E-02
7.32E-02
7.33E-02
20
7.43E-02
7.40E-02
7.30E-02
7.43E-02
7.38E-02
7.39E-02
7.38E-02
7.29E-02
7.35E-02
7.33E-02
7.27E-02
30
7.48E-02
7.43E-02
7.33E-02
7.49E-02
7.42E-02
7.39E-02
7.37E-02
7.27E-02
7.39E-02
7.38E-02
7.29E-02
50
7.53E-02
7.50E-02
7.42E-02
7.50E-02
7.46E-02
7.42E-02
7.39E-02
7.34E-02
7.43E-02
7.39E-02
7.34E-02
60
7.56E-02
7.49E-02
7.41E-02
7.54E-02
7.51E-02
7.44E-02
7.43E-02
7.37E-02
7.44E-02
7.39E-02
7.32E-02
70
7.48E-02
7.43E-02
7.29E-02
7.47E-02
7.39E-02
7.44E-02
7.35E-02
7.34E-02
7.39E-02
7.34E-02
7.36E-02
7.33E-02
4.11E-04
7.44E-02
7.21E-02
7.37E-02
4.48E-04
7.49E-02
7.25E-02
7.39E-02
5.38E-04
7.53E-02
7.24E-02
7.43E-02
6.50E-04
7.61E-02
7.25E-02
7.48E-02
4.40E-04
7.60E-02
7.36E-02
7.50E-02
5.99E-04
7.67E-02
7.34E-02
7.41E-02
7.66E-04
7.62E-02
7.20E-02
7.32E-02
4.15E-04
7.44E-02
7.21E-02
2.00E-01
PASS
7.33E-02
4.04E-04
7.44E-02
7.22E-02
2.00E-01
PASS
7.35E-02
3.98E-04
7.46E-02
7.24E-02
2.00E-01
PASS
7.36E-02
4.82E-04
7.49E-02
7.23E-02
2.00E-01
PASS
7.39E-02
3.40E-04
7.49E-02
7.30E-02
2.00E-01
PASS
7.41E-02
3.36E-04
7.50E-02
7.32E-02
2.00E-01
PASS
7.37E-02
4.01E-04
7.48E-02
7.26E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
526
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V)
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
2.50E-01
2.00E-01
1.50E-01
1.00E-01
5.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.260. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) versus total dose. The data show
no significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
527
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.260. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) versus total
dose, including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
7.39E-02
7.42E-02
7.47E-02
7.43E-02
7.37E-02
7.41E-02
7.40E-02
7.41E-02
7.43E-02
7.48E-02
7.35E-02
10
7.44E-02
7.47E-02
7.51E-02
7.46E-02
7.38E-02
7.43E-02
7.35E-02
7.43E-02
7.44E-02
7.46E-02
7.34E-02
20
7.50E-02
7.50E-02
7.52E-02
7.48E-02
7.45E-02
7.43E-02
7.36E-02
7.42E-02
7.47E-02
7.46E-02
7.31E-02
30
7.53E-02
7.54E-02
7.59E-02
7.51E-02
7.47E-02
7.43E-02
7.40E-02
7.44E-02
7.49E-02
7.51E-02
7.36E-02
50
7.58E-02
7.60E-02
7.61E-02
7.57E-02
7.53E-02
7.52E-02
7.44E-02
7.48E-02
7.53E-02
7.52E-02
7.35E-02
60
7.59E-02
7.61E-02
7.62E-02
7.59E-02
7.54E-02
7.51E-02
7.50E-02
7.48E-02
7.54E-02
7.55E-02
7.36E-02
70
7.51E-02
7.52E-02
7.53E-02
7.49E-02
7.43E-02
7.45E-02
7.40E-02
7.48E-02
7.51E-02
7.54E-02
7.41E-02
7.42E-02
4.13E-04
7.53E-02
7.30E-02
7.45E-02
4.79E-04
7.58E-02
7.32E-02
7.49E-02
2.63E-04
7.56E-02
7.42E-02
7.53E-02
4.44E-04
7.65E-02
7.41E-02
7.58E-02
2.98E-04
7.66E-02
7.49E-02
7.59E-02
3.01E-04
7.67E-02
7.51E-02
7.50E-02
3.86E-04
7.60E-02
7.39E-02
7.43E-02
3.36E-04
7.52E-02
7.33E-02
2.00E-01
PASS
7.42E-02
4.19E-04
7.53E-02
7.30E-02
2.00E-01
PASS
7.42E-02
4.30E-04
7.54E-02
7.31E-02
2.00E-01
PASS
7.45E-02
4.36E-04
7.57E-02
7.33E-02
2.00E-01
PASS
7.50E-02
3.73E-04
7.60E-02
7.40E-02
2.00E-01
PASS
7.52E-02
2.84E-04
7.59E-02
7.44E-02
2.00E-01
PASS
7.47E-02
5.13E-04
7.62E-02
7.33E-02
2.00E-01
PASS
An ISO 9001:2000 Certified Company
528
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 5V #1 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.261. Plot of Positive Short-Circuit Current @ 5V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
529
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.261. Raw data for Positive Short-Circuit Current @ 5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 5V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.34E-02
-2.51E-02
-2.50E-02
-2.44E-02
-2.44E-02
-2.38E-02
-2.50E-02
-2.51E-02
-2.46E-02
-2.46E-02
-2.45E-02
10
-2.28E-02
-2.45E-02
-2.44E-02
-2.36E-02
-2.36E-02
-2.34E-02
-2.45E-02
-2.47E-02
-2.40E-02
-2.42E-02
-2.44E-02
20
-2.25E-02
-2.42E-02
-2.41E-02
-2.33E-02
-2.33E-02
-2.31E-02
-2.43E-02
-2.46E-02
-2.37E-02
-2.40E-02
-2.44E-02
30
-2.23E-02
-2.40E-02
-2.40E-02
-2.32E-02
-2.32E-02
-2.30E-02
-2.42E-02
-2.45E-02
-2.36E-02
-2.39E-02
-2.45E-02
50
-2.19E-02
-2.37E-02
-2.37E-02
-2.28E-02
-2.28E-02
-2.27E-02
-2.39E-02
-2.42E-02
-2.32E-02
-2.37E-02
-2.45E-02
60
-2.20E-02
-2.38E-02
-2.37E-02
-2.29E-02
-2.29E-02
-2.28E-02
-2.40E-02
-2.43E-02
-2.33E-02
-2.38E-02
-2.45E-02
70
-2.23E-02
-2.41E-02
-2.41E-02
-2.33E-02
-2.33E-02
-2.30E-02
-2.42E-02
-2.45E-02
-2.36E-02
-2.39E-02
-2.45E-02
-2.44E-02
6.61E-04
-2.26E-02
-2.63E-02
-2.38E-02
6.65E-04
-2.20E-02
-2.56E-02
-2.35E-02
7.01E-04
-2.16E-02
-2.54E-02
-2.33E-02
7.10E-04
-2.14E-02
-2.53E-02
-2.30E-02
7.42E-04
-2.09E-02
-2.50E-02
-2.31E-02
7.28E-04
-2.11E-02
-2.51E-02
-2.34E-02
7.32E-04
-2.14E-02
-2.54E-02
-2.46E-02
5.21E-04
-2.32E-02
-2.60E-02
-1.25E-02
PASS
-2.42E-02
5.32E-04
-2.27E-02
-2.56E-02
-8.00E-03
PASS
-2.40E-02
5.56E-04
-2.24E-02
-2.55E-02
-8.00E-03
PASS
-2.38E-02
5.63E-04
-2.23E-02
-2.54E-02
-8.00E-03
PASS
-2.36E-02
5.83E-04
-2.20E-02
-2.51E-02
-8.00E-03
PASS
-2.36E-02
5.73E-04
-2.21E-02
-2.52E-02
-8.00E-03
PASS
-2.38E-02
5.51E-04
-2.23E-02
-2.54E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
530
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 5V #2 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.262. Plot of Positive Short-Circuit Current @ 5V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
531
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.262. Raw data for Positive Short-Circuit Current @ 5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 5V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.37E-02
-2.42E-02
-2.59E-02
-2.36E-02
-2.50E-02
-2.51E-02
-2.42E-02
-2.58E-02
-2.52E-02
-2.50E-02
-2.50E-02
10
-2.29E-02
-2.35E-02
-2.51E-02
-2.28E-02
-2.41E-02
-2.48E-02
-2.36E-02
-2.53E-02
-2.46E-02
-2.47E-02
-2.50E-02
20
-2.25E-02
-2.32E-02
-2.48E-02
-2.24E-02
-2.37E-02
-2.46E-02
-2.34E-02
-2.51E-02
-2.43E-02
-2.45E-02
-2.50E-02
30
-2.23E-02
-2.30E-02
-2.46E-02
-2.23E-02
-2.35E-02
-2.45E-02
-2.33E-02
-2.49E-02
-2.42E-02
-2.44E-02
-2.50E-02
50
-2.19E-02
-2.27E-02
-2.43E-02
-2.19E-02
-2.31E-02
-2.43E-02
-2.30E-02
-2.46E-02
-2.38E-02
-2.41E-02
-2.50E-02
60
-2.20E-02
-2.28E-02
-2.44E-02
-2.20E-02
-2.32E-02
-2.44E-02
-2.31E-02
-2.48E-02
-2.39E-02
-2.42E-02
-2.51E-02
70
-2.24E-02
-2.32E-02
-2.47E-02
-2.24E-02
-2.36E-02
-2.45E-02
-2.33E-02
-2.49E-02
-2.42E-02
-2.44E-02
-2.50E-02
-2.45E-02
9.64E-04
-2.18E-02
-2.71E-02
-2.37E-02
9.47E-04
-2.11E-02
-2.63E-02
-2.33E-02
9.63E-04
-2.07E-02
-2.60E-02
-2.32E-02
9.77E-04
-2.05E-02
-2.58E-02
-2.28E-02
9.99E-04
-2.00E-02
-2.55E-02
-2.28E-02
9.89E-04
-2.01E-02
-2.56E-02
-2.33E-02
9.89E-04
-2.05E-02
-2.60E-02
-2.51E-02
5.82E-04
-2.35E-02
-2.66E-02
-1.25E-02
PASS
-2.46E-02
6.19E-04
-2.29E-02
-2.63E-02
-8.00E-03
PASS
-2.44E-02
6.24E-04
-2.27E-02
-2.61E-02
-8.00E-03
PASS
-2.42E-02
6.18E-04
-2.25E-02
-2.59E-02
-8.00E-03
PASS
-2.40E-02
6.34E-04
-2.22E-02
-2.57E-02
-8.00E-03
PASS
-2.41E-02
6.28E-04
-2.23E-02
-2.58E-02
-8.00E-03
PASS
-2.43E-02
6.00E-04
-2.26E-02
-2.59E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
532
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 5V #3 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.263. Plot of Positive Short-Circuit Current @ 5V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
533
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.263. Raw data for Positive Short-Circuit Current @ 5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 5V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.37E-02
-2.41E-02
-2.61E-02
-2.36E-02
-2.46E-02
-2.51E-02
-2.45E-02
-2.58E-02
-2.49E-02
-2.50E-02
-2.50E-02
10
-2.30E-02
-2.34E-02
-2.53E-02
-2.28E-02
-2.37E-02
-2.48E-02
-2.40E-02
-2.53E-02
-2.43E-02
-2.46E-02
-2.49E-02
20
-2.26E-02
-2.30E-02
-2.50E-02
-2.25E-02
-2.33E-02
-2.46E-02
-2.37E-02
-2.50E-02
-2.41E-02
-2.44E-02
-2.49E-02
30
-2.23E-02
-2.29E-02
-2.48E-02
-2.23E-02
-2.31E-02
-2.45E-02
-2.36E-02
-2.49E-02
-2.39E-02
-2.43E-02
-2.50E-02
50
-2.19E-02
-2.26E-02
-2.45E-02
-2.19E-02
-2.26E-02
-2.43E-02
-2.33E-02
-2.46E-02
-2.36E-02
-2.40E-02
-2.50E-02
60
-2.20E-02
-2.26E-02
-2.46E-02
-2.20E-02
-2.28E-02
-2.44E-02
-2.34E-02
-2.47E-02
-2.37E-02
-2.41E-02
-2.50E-02
70
-2.24E-02
-2.30E-02
-2.49E-02
-2.24E-02
-2.32E-02
-2.45E-02
-2.36E-02
-2.49E-02
-2.39E-02
-2.43E-02
-2.50E-02
-2.44E-02
9.97E-04
-2.17E-02
-2.71E-02
-2.36E-02
1.00E-03
-2.09E-02
-2.64E-02
-2.33E-02
1.02E-03
-2.05E-02
-2.61E-02
-2.31E-02
1.04E-03
-2.03E-02
-2.59E-02
-2.27E-02
1.05E-03
-1.98E-02
-2.56E-02
-2.28E-02
1.05E-03
-1.99E-02
-2.57E-02
-2.32E-02
1.04E-03
-2.03E-02
-2.60E-02
-2.50E-02
4.58E-04
-2.38E-02
-2.63E-02
-1.25E-02
PASS
-2.46E-02
4.95E-04
-2.32E-02
-2.59E-02
-8.00E-03
PASS
-2.44E-02
5.05E-04
-2.30E-02
-2.58E-02
-8.00E-03
PASS
-2.42E-02
5.06E-04
-2.29E-02
-2.56E-02
-8.00E-03
PASS
-2.39E-02
5.22E-04
-2.25E-02
-2.54E-02
-8.00E-03
PASS
-2.41E-02
5.10E-04
-2.27E-02
-2.55E-02
-8.00E-03
PASS
-2.43E-02
4.86E-04
-2.29E-02
-2.56E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
534
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Positive Short-Circuit Current @ 5V #4 (A)
0.00E+00
-5.00E-03
-1.00E-02
-1.50E-02
-2.00E-02
-2.50E-02
-3.00E-02
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.264. Plot of Positive Short-Circuit Current @ 5V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
535
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.264. Raw data for Positive Short-Circuit Current @ 5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Positive Short-Circuit Current @ 5V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
24 hr
Anneal
168 hr
Anneal
0
-2.38E-02
-2.53E-02
-2.47E-02
-2.45E-02
-2.42E-02
-2.39E-02
-2.51E-02
-2.49E-02
-2.49E-02
-2.46E-02
-2.45E-02
10
-2.32E-02
-2.47E-02
-2.41E-02
-2.38E-02
-2.35E-02
-2.36E-02
-2.46E-02
-2.46E-02
-2.43E-02
-2.43E-02
-2.44E-02
20
-2.28E-02
-2.44E-02
-2.39E-02
-2.35E-02
-2.32E-02
-2.33E-02
-2.44E-02
-2.44E-02
-2.40E-02
-2.41E-02
-2.44E-02
30
-2.26E-02
-2.42E-02
-2.37E-02
-2.34E-02
-2.30E-02
-2.32E-02
-2.43E-02
-2.43E-02
-2.38E-02
-2.40E-02
-2.45E-02
50
-2.23E-02
-2.39E-02
-2.34E-02
-2.30E-02
-2.27E-02
-2.29E-02
-2.40E-02
-2.41E-02
-2.35E-02
-2.37E-02
-2.45E-02
60
-2.24E-02
-2.40E-02
-2.35E-02
-2.31E-02
-2.27E-02
-2.30E-02
-2.41E-02
-2.42E-02
-2.36E-02
-2.38E-02
-2.45E-02
70
-2.27E-02
-2.43E-02
-2.38E-02
-2.35E-02
-2.31E-02
-2.32E-02
-2.43E-02
-2.43E-02
-2.38E-02
-2.40E-02
-2.45E-02
-2.45E-02
5.70E-04
-2.29E-02
-2.61E-02
-2.38E-02
5.77E-04
-2.23E-02
-2.54E-02
-2.35E-02
6.08E-04
-2.19E-02
-2.52E-02
-2.34E-02
6.11E-04
-2.17E-02
-2.51E-02
-2.30E-02
6.38E-04
-2.13E-02
-2.48E-02
-2.31E-02
6.31E-04
-2.14E-02
-2.49E-02
-2.35E-02
6.30E-04
-2.17E-02
-2.52E-02
-2.47E-02
4.45E-04
-2.35E-02
-2.59E-02
-1.25E-02
PASS
-2.43E-02
4.25E-04
-2.31E-02
-2.54E-02
-8.00E-03
PASS
-2.41E-02
4.39E-04
-2.28E-02
-2.53E-02
-8.00E-03
PASS
-2.39E-02
4.44E-04
-2.27E-02
-2.51E-02
-8.00E-03
PASS
-2.36E-02
4.60E-04
-2.24E-02
-2.49E-02
-8.00E-03
PASS
-2.37E-02
4.51E-04
-2.25E-02
-2.50E-02
-8.00E-03
PASS
-2.39E-02
4.43E-04
-2.27E-02
-2.51E-02
-8.00E-03
PASS
An ISO 9001:2000 Certified Company
536
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 5V #1 (A)
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.265. Plot of Negative Short-Circuit Current @ 5V #1 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
537
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.265. Raw data for Negative Short-Circuit Current @ 5V #1 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 5V #1 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.79E-02
4.95E-02
4.94E-02
5.03E-02
4.95E-02
4.82E-02
4.94E-02
4.89E-02
4.94E-02
4.86E-02
4.84E-02
10
4.77E-02
4.93E-02
4.93E-02
5.01E-02
4.94E-02
4.82E-02
4.97E-02
4.90E-02
4.98E-02
4.88E-02
4.87E-02
20
4.75E-02
4.92E-02
4.92E-02
5.00E-02
4.93E-02
4.82E-02
4.95E-02
4.89E-02
4.97E-02
4.87E-02
4.87E-02
30
4.73E-02
4.89E-02
4.88E-02
4.96E-02
4.89E-02
4.80E-02
4.94E-02
4.88E-02
4.94E-02
4.86E-02
4.85E-02
50
4.69E-02
4.87E-02
4.86E-02
4.94E-02
4.87E-02
4.78E-02
4.92E-02
4.86E-02
4.93E-02
4.85E-02
4.84E-02
60
4.68E-02
4.84E-02
4.84E-02
4.92E-02
4.86E-02
4.77E-02
4.90E-02
4.84E-02
4.90E-02
4.82E-02
4.83E-02
70
4.75E-02
4.91E-02
4.90E-02
4.98E-02
4.90E-02
4.80E-02
4.93E-02
4.87E-02
4.94E-02
4.85E-02
4.84E-02
4.93E-02
8.45E-04
5.16E-02
4.70E-02
4.92E-02
8.97E-04
5.16E-02
4.67E-02
4.90E-02
9.18E-04
5.16E-02
4.65E-02
4.87E-02
8.72E-04
5.11E-02
4.63E-02
4.85E-02
9.11E-04
5.10E-02
4.60E-02
4.83E-02
8.84E-04
5.07E-02
4.59E-02
4.89E-02
8.47E-04
5.12E-02
4.66E-02
4.89E-02
5.34E-04
5.04E-02
4.74E-02
1.25E-02
PASS
4.91E-02
6.46E-04
5.09E-02
4.73E-02
8.00E-03
PASS
4.90E-02
6.09E-04
5.07E-02
4.73E-02
8.00E-03
PASS
4.88E-02
6.21E-04
5.05E-02
4.71E-02
8.00E-03
PASS
4.87E-02
5.91E-04
5.03E-02
4.70E-02
8.00E-03
PASS
4.85E-02
5.81E-04
5.01E-02
4.69E-02
8.00E-03
PASS
4.88E-02
6.03E-04
5.04E-02
4.71E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
538
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 5V #2 (A)
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.266. Plot of Negative Short-Circuit Current @ 5V #2 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
539
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.266. Raw data for Negative Short-Circuit Current @ 5V #2 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 5V #2 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.84E-02
4.79E-02
5.05E-02
4.78E-02
4.84E-02
4.94E-02
4.88E-02
4.90E-02
4.89E-02
4.86E-02
4.89E-02
10
4.81E-02
4.77E-02
5.03E-02
4.77E-02
4.83E-02
4.95E-02
4.91E-02
4.92E-02
4.92E-02
4.88E-02
4.92E-02
20
4.80E-02
4.76E-02
5.01E-02
4.76E-02
4.82E-02
4.95E-02
4.89E-02
4.91E-02
4.91E-02
4.87E-02
4.93E-02
30
4.77E-02
4.74E-02
4.99E-02
4.73E-02
4.78E-02
4.93E-02
4.88E-02
4.89E-02
4.89E-02
4.86E-02
4.90E-02
50
4.74E-02
4.71E-02
4.95E-02
4.70E-02
4.77E-02
4.92E-02
4.86E-02
4.87E-02
4.87E-02
4.84E-02
4.90E-02
60
4.72E-02
4.69E-02
4.94E-02
4.69E-02
4.75E-02
4.89E-02
4.84E-02
4.86E-02
4.86E-02
4.82E-02
4.89E-02
70
4.80E-02
4.75E-02
5.00E-02
4.74E-02
4.80E-02
4.93E-02
4.87E-02
4.89E-02
4.88E-02
4.85E-02
4.91E-02
4.86E-02
1.08E-03
5.16E-02
4.57E-02
4.84E-02
1.06E-03
5.13E-02
4.55E-02
4.83E-02
1.05E-03
5.12E-02
4.54E-02
4.80E-02
1.07E-03
5.09E-02
4.51E-02
4.77E-02
1.04E-03
5.06E-02
4.49E-02
4.76E-02
1.06E-03
5.05E-02
4.47E-02
4.82E-02
1.06E-03
5.11E-02
4.53E-02
4.89E-02
3.15E-04
4.98E-02
4.81E-02
1.25E-02
PASS
4.91E-02
2.63E-04
4.99E-02
4.84E-02
8.00E-03
PASS
4.91E-02
3.02E-04
4.99E-02
4.82E-02
8.00E-03
PASS
4.89E-02
2.66E-04
4.96E-02
4.82E-02
8.00E-03
PASS
4.87E-02
2.77E-04
4.95E-02
4.79E-02
8.00E-03
PASS
4.85E-02
2.63E-04
4.93E-02
4.78E-02
8.00E-03
PASS
4.88E-02
2.81E-04
4.96E-02
4.81E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
540
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 5V #3 (A)
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.267. Plot of Negative Short-Circuit Current @ 5V #3 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
541
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.267. Raw data for Negative Short-Circuit Current @ 5V #3 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 5V #3 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.90E-02
4.83E-02
5.09E-02
4.83E-02
4.89E-02
4.97E-02
4.95E-02
4.95E-02
4.94E-02
4.92E-02
4.95E-02
10
4.87E-02
4.81E-02
5.07E-02
4.82E-02
4.88E-02
4.98E-02
4.98E-02
4.97E-02
4.97E-02
4.94E-02
4.98E-02
20
4.85E-02
4.80E-02
5.05E-02
4.81E-02
4.87E-02
4.98E-02
4.97E-02
4.96E-02
4.95E-02
4.93E-02
4.98E-02
30
4.82E-02
4.77E-02
5.03E-02
4.78E-02
4.83E-02
4.96E-02
4.94E-02
4.94E-02
4.94E-02
4.92E-02
4.96E-02
50
4.78E-02
4.75E-02
4.99E-02
4.76E-02
4.81E-02
4.94E-02
4.93E-02
4.92E-02
4.92E-02
4.91E-02
4.96E-02
60
4.77E-02
4.73E-02
4.98E-02
4.74E-02
4.80E-02
4.93E-02
4.91E-02
4.90E-02
4.90E-02
4.88E-02
4.95E-02
70
4.84E-02
4.78E-02
5.04E-02
4.80E-02
4.84E-02
4.95E-02
4.94E-02
4.93E-02
4.94E-02
4.91E-02
4.97E-02
4.91E-02
1.04E-03
5.19E-02
4.62E-02
4.89E-02
1.03E-03
5.17E-02
4.60E-02
4.87E-02
1.03E-03
5.16E-02
4.59E-02
4.85E-02
1.04E-03
5.13E-02
4.56E-02
4.82E-02
9.97E-04
5.09E-02
4.54E-02
4.80E-02
1.01E-03
5.08E-02
4.52E-02
4.86E-02
1.03E-03
5.14E-02
4.58E-02
4.95E-02
1.99E-04
5.00E-02
4.89E-02
1.25E-02
PASS
4.97E-02
1.49E-04
5.01E-02
4.92E-02
8.00E-03
PASS
4.96E-02
1.79E-04
5.01E-02
4.91E-02
8.00E-03
PASS
4.94E-02
1.67E-04
4.99E-02
4.89E-02
8.00E-03
PASS
4.92E-02
1.36E-04
4.96E-02
4.88E-02
8.00E-03
PASS
4.91E-02
1.79E-04
4.96E-02
4.86E-02
8.00E-03
PASS
4.93E-02
1.63E-04
4.98E-02
4.89E-02
8.00E-03
PASS
An ISO 9001:2000 Certified Company
542
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Negative Short-Circuit Current @ 5V #4 (A)
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
60
24-hr
Anneal
70
168-hr
Anneal
Figure 5.268. Plot of Negative Short-Circuit Current @ 5V #4 (A) versus total dose. The data show no
significant change with radiation. The solid diamonds are the average of the measured data points for the
sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points
for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the
data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray
lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
An ISO 9001:2000 Certified Company
543
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
Table 5.268. Raw data for Negative Short-Circuit Current @ 5V #4 (A) versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Total Dose (krad(Si))
Negative Short-Circuit Current @ 5V #4 (A)
Device
866
867
868
869
870
871
872
873
874
876
877
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
24 hr
Anneal
168 hr
Anneal
0
4.72E-02
4.87E-02
4.87E-02
4.92E-02
4.86E-02
4.74E-02
4.86E-02
4.81E-02
4.87E-02
4.76E-02
4.76E-02
10
4.69E-02
4.86E-02
4.86E-02
4.90E-02
4.84E-02
4.75E-02
4.89E-02
4.82E-02
4.89E-02
4.78E-02
4.78E-02
20
4.67E-02
4.84E-02
4.84E-02
4.89E-02
4.84E-02
4.74E-02
4.88E-02
4.82E-02
4.88E-02
4.77E-02
4.78E-02
30
4.65E-02
4.82E-02
4.81E-02
4.86E-02
4.81E-02
4.72E-02
4.86E-02
4.79E-02
4.87E-02
4.76E-02
4.77E-02
50
4.61E-02
4.78E-02
4.78E-02
4.83E-02
4.78E-02
4.70E-02
4.84E-02
4.78E-02
4.85E-02
4.75E-02
4.77E-02
60
4.60E-02
4.77E-02
4.77E-02
4.81E-02
4.77E-02
4.69E-02
4.82E-02
4.76E-02
4.83E-02
4.72E-02
4.76E-02
70
4.67E-02
4.83E-02
4.83E-02
4.87E-02
4.82E-02
4.72E-02
4.86E-02
4.80E-02
4.87E-02
4.75E-02
4.77E-02
4.85E-02
7.51E-04
5.05E-02
4.64E-02
4.83E-02
8.24E-04
5.05E-02
4.60E-02
4.82E-02
8.33E-04
5.05E-02
4.59E-02
4.79E-02
8.10E-04
5.01E-02
4.57E-02
4.76E-02
8.38E-04
4.99E-02
4.53E-02
4.74E-02
8.21E-04
4.97E-02
4.52E-02
4.80E-02
7.86E-04
5.02E-02
4.59E-02
4.81E-02
5.72E-04
4.96E-02
4.65E-02
1.25E-02
PASS
4.83E-02
6.41E-04
5.00E-02
4.65E-02
8.00E-03
PASS
4.82E-02
6.32E-04
4.99E-02
4.65E-02
8.00E-03
PASS
4.80E-02
6.23E-04
4.97E-02
4.63E-02
8.00E-03
PASS
4.79E-02
6.15E-04
4.95E-02
4.62E-02
8.00E-03
PASS
4.77E-02
6.19E-04
4.94E-02
4.60E-02
8.00E-03
PASS
4.80E-02
6.48E-04
4.97E-02
4.62E-02
8.00E-03
PASS
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6.0. Summary / Conclusions
The low dose rate total ionizing dose testing described in this final report was performed using the
facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. For the low
dose rate ELDRS testing described in this report, the devices were placed approximately 2-meters from
the Co-60 rods to achieve the required 10mrad(Si)/s dose rate. Samples of the RH1499MW quad
operational amplifier described in this report were irradiated biased with a split 15V supply and
unbiased (all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level
of 50krad(Si) with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si).
Electrical testing occurred within one hour following the end of each irradiation segment. For
intermediate irradiations, the units were tested and returned to total dose exposure within two hours from
the end of the previous radiation increment. In addition, all units-under-test received a 24hr room
temperature and168hr 100°C anneal, using the same bias conditions as the radiation exposure.
The parametric data was obtained as “read and record” and all the raw data plus an attributes summary
were presented in this report. The attributes data contains the average, standard deviation and the
average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 90/90 and a 5-piece sample size. Note that the following criteria was used to
determine the outcome of the testing: following the radiation exposure each parameter had to pass the
specification value and the average value for the ten-piece sample must pass the specification value
when the KTL limits are applied. If these conditions were not both satisfied following the radiation
exposure, then the lot would be logged as an RLAT failure.
Using the conditions stated above, the RH1499MW devices passed the ELDRS test to 30krad(Si) but
failed at 50krad(Si) due to degradation of the output voltage swing and short circuit current for the
single-sided 3V supply condition and power supply rejection ratio at the single-sided 2.2V to 12V
supply range. Most measured parameters showed no significant degradation with radiation and all
parameters passed to 50krad(Si) when tested using the 15V split supply condition.
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Appendix A: Photograph of device-under-test to show part markings
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Appendix B: TID Bias Connections
Biased Samples:
Pin
Function
Connection / Bias
1
OUT A
To Pin 2 via 5kΩ & 40pF, in Parallel
2
-INPUT A
To Pin 1 via 5kΩ & 40pF, in Parallel
3
+INPUT A
To 8V via 5kΩ Resistor
4
V+
To +15V using 0.1μF Decoupling
5
+INPUT B
To 8V via 5kΩ Resistor
6
-INPUT B
To Pin 7 via 5kΩ & 40pF, in Parallel
7
OUT B
To Pin 6 via 5kΩ & 40pF, in Parallel
8
OUT C
To Pin 9 via 5kΩ & 40pF, in Parallel
9
-INPUT C
To Pin 8 via 5kΩ & 40pF, in Parallel
10
+INPUT C
To 8V via 5kΩ Resistor
11
V-
To -15V using 0.1μF Decoupling
12
+INPUT D
To 8V via 10kΩ Resistor
13
-INPUT D
To Pin 14 via 5kΩ & 40pF, in Parallel
14
OUT D
To Pin 13 via 5kΩ & 40pF, in Parallel
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Unbiased Samples:
Pin
Function
Connection / Bias
1
OUT A
GND
2
-INPUT A
GND
3
+INPUT A
GND
4
V+
GND
5
+INPUT B
GND
6
-INPUT B
GND
7
OUT B
GND
8
OUT C
GND
9
-INPUT C
GND
10
+INPUT C
GND
11
V-
GND
12
+INPUT D
GND
13
-INPUT D
GND
14
OUT D
GND
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Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted
from LINEAR TECHNOLOGY CORPORATION, RH1499M Datasheet.
Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY
CORPORATION, RH1499M Datasheet.
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Appendix C: Electrical Test Parameters and Conditions
All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test
Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter
measurements for a variety of digital, analog and mixed signal products including voltage regulators,
voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and
sensitivity through the use of software self-calibration and an internal relay matrix with separate family
boards and custom personality adapter boards. The tester uses this relay matrix to connect the required
test circuits, select the appropriate voltage / current sources and establish the needed measurement loops
for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1499 BGS-061114 DUT board. The measured parameters and test
conditions are shown in Tables C.1 (VS=±15V), C.2 (VS=3V), and C.3 (VS=5V).
A listing of the measurement precision/resolution for each parameter is shown in Tables C.4
(VS=±15V), C.5 (VS=3V), and C.6 (VS=5V). The precision/resolution values were obtained either from
test data or from the DAC resolution of the LTS-2020. To generate the precision/resolution shown in
Table C.4 through C.6, one of the units-under-test was tested repetitively (a total of 10-times with reinsertion between tests) to obtain the average test value and standard deviation. Using this test data
MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the
final measurement range. This value encompasses the precision/resolution of all aspects of the test
system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as
insertion error. In some cases, the measurement resolution is limited by the internal DACs, which
results in a measured standard deviation of zero. In these instances the precision/resolution will be
reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where
the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation.
If necessary, larger samples sizes could be used to qualify these parameters using an “attributes”
approach.
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Table C.1. Measured parameters and test conditions for VS=±15V.
TEST DESCRIPTION
Positive Supply Current
Negative Supply Current
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
Input Offset Voltage (Op Amp 1-4)
Input Offset Current (Op Amp 1-4)
+ Input Bias Current (Op Amp 1-4)
- Input Bias Current (Op Amp 1-4)
Large Signal Voltage Gain (Op Amp 1-4)
Large Signal Voltage Gain (Op Amp 1-4)
CMRR (Op Amp 1-4)
CMRR Matching 1-4
CMRR Matching 2-3
PSRR (Op Amp 1-4)
PSRR Matching 1-4
PSRR Matching 2-3
Output Voltage Swing High (Op Amp 1-4)
Output Voltage Swing High (Op Amp 1-4)
Output Voltage Swing High (Op Amp 1-4)
Output Voltage Swing Low (Op Amp 1-4)
Output Voltage Swing Low (Op Amp 1-4)
Output Voltage Swing Low (Op Amp 1-4)
+VS Short-Circuit Current (Op Amp 1-4)
-VS Short-Circuit Current (Op Amp 1-4)
TEST CONDITIONS
V+=15V and V-=-15V
V+=15V and V-=-15V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=0V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=15V
V+=15V, V-=-15V and VCM=-15V
V+=15V, V-=-15V and VCM=-15V
V+=15V, V-=-15V and VCM=-15V
V+=15V, V-=-15V and VCM=-15V
RL = 10kΩ, VO = ±14.5V
RL = 2kΩ, VO = ±10V
VS=±15V, VCM=±15V
VS=±15V, VCM=±15V
VS=±15V, VCM=±15V
VS=±2V to VS=±16V
VS=±2V to VS=±16V
VS=±2V to VS=±16V
VS=±15V, No Load
VS=±15V, ISOURCE=1mA
VS=±15V, ISOURCE =10mA
VS=±15V, No Load
VS=±15V, ISINK=1mA
VS=±15V, ISINK=10mA
VS=±15V
VS=±15V
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Table C.2. Measured parameters and test conditions for VS=3V.
TEST DESCRIPTION
TEST CONDITIONS
Positive Supply Current
V+=3V and V-=0V
Negative Supply Current
V+=3V and V-=0V
Input Offset Voltage (Op Amp 1-4)
V+=3V, V-=0V and VCM=0V
Input Offset Current (Op Amp 1-4)
V+=3V, V-=0V and VCM=0V
+ Input Bias Current (Op Amp 1-4)
V+=3V, V-=0V and VCM=0V
- Input Bias Current (Op Amp 1-4)
V+=3V, V-=0V and VCM=0V
Input Offset Voltage (Op Amp 1-4)
V+=3V, V-=0V and VCM=3V
Input Offset Current (Op Amp 1-4)
V+=3V, V-=0V and VCM=3V
+ Input Bias Current (Op Amp 1-4)
V+=3V, V-=0V and VCM=3V
- Input Bias Current (Op Amp 1-4)
V+=3V, V-=0V and VCM=3V
Large Signal Voltage Gain (Op Amp 1-4) RL = 10kΩ, VO=75mV to 2.8V
CMRR (Op Amp 1-4)
VS=3V, VCM=0-3V
CMRR Matching 1-4
VS=3V, VCM=0-3V
CMRR Matching 2-3
VS=3V, VCM=0-3V
Output Voltage Swing High (Op Amp 1-4)
VS=3V, No Load
Output Voltage Swing High (Op Amp 1-4)
VS=3V, ISOURCE=1mA
Output Voltage Swing High (Op Amp 1-4)
VS=3V, ISOURCE=2.5mA
Output Voltage Swing Low (Op Amp 1-4)
VS=3V, No Load
Output Voltage Swing Low (Op Amp 1-4)
VS=3V, ISINK=1mA
Output Voltage Swing Low (Op Amp 1-4)
VS=3V, ISINK=2.5mA
+VS Short-Circuit Current (Op Amp 1-4)
VS=3V
-VS Short-Circuit Current (Op Amp 1-4)
VS=3V
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Table C.3. Measured parameters and test conditions for VS=5V.
TEST DESCRIPTION
TEST CONDITIONS
Positive Supply Current
V+=5V and V-=0V
Negative Supply Current
V+=5V and V-=0V
Input Offset Voltage (Op Amp 1-4)
V+=5V, V-=0V and VCM=0V
Input Offset Current (Op Amp 1-4)
V+=5V, V-=0V and VCM=0V
+ Input Bias Current (Op Amp 1-4)
V+=5V, V-=0V and VCM=0V
- Input Bias Current (Op Amp 1-4)
V+=5V, V-=0V and VCM=0V
Input Offset Voltage (Op Amp 1-4)
V+=5V, V-=0V and VCM=5V
Input Offset Current (Op Amp 1-4)
V+=5V, V-=0V and VCM=5V
+ Input Bias Current (Op Amp 1-4)
V+=5V, V-=0V and VCM=5V
- Input Bias Current (Op Amp 1-4)
V+=5V, V-=0V and VCM=5V
Large Signal Voltage Gain (Op Amp 1-4) RL = 10kΩ, VO=75mV to 4.8V
CMRR (Op Amp 1-4)
VS=5V, VCM=0-5V
CMRR Matching 1-4
VS=5V, VCM=0-5V
CMRR Matching 2-3
VS=5V, VCM=0-5V
PSRR (Op Amp 1-4)
VS=2.2V to VS=12V
PSRR Matching 1-4
VS=2.2V to VS=12V
PSRR Matching 2-3
VS=2.2V to VS=12V
Output Voltage Swing High (Op Amp 1-4)
VS=5V, No Load
Output Voltage Swing High (Op Amp 1-4)
VS=5V, ISOURCE=1mA
Output Voltage Swing High (Op Amp 1-4)
VS=5V, ISOURCE=2.5mA
Output Voltage Swing Low (Op Amp 1-4)
VS=5V, No Load
Output Voltage Swing Low (Op Amp 1-4)
VS=5V, ISINK=1mA
Output Voltage Swing Low (Op Amp 1-4)
VS=5V, ISINK=2.5mA
+VS Short-Circuit Current (Op Amp 1-4)
VS=5V
-VS Short-Circuit Current (Op Amp 1-4)
VS=5V
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Table C.4. Measured parameters, pre-irradiation specifications and measurement resolutions
for VS=±15V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Measured Parameter
Positive Supply Current
Negative Supply Current
Input Offset Voltage
Input Offset Current
+ Input Bias Current
- Input Bias Current
Large Signal Voltage Gain (10kΩ Load)
Large Signal Voltage Gain (2kΩ Load)
Common Mode Rejection Ratio
Common Mode Rejection Ratio Matching
Power Supply Rejection Ratio
Power Supply Rejection Ratio Matching
Output Voltage Swing High (No Load)
Output Voltage Swing High (ISOURCE=1mA)
Output Voltage Swing High (ISOURCE=10mA)
Output Voltage Swing Low (No Load)
Output Voltage Swing Low (ISINK=1mA)
Output Voltage Swing Low (ISINK=10mA)
+VS Short Circuit Current
-VS Short Circuit Current
10mA
-10mA
±800μV
±70nA
±715nA
±715nA
1000V/mV
500V/mV
90dB
84dB
90dB
83dB
10mV
150mV
800mV
30mV
100mV
500mV
±15mA
±15mA
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± 1.08E-04A
± 1.05E-04A
± 1.91E-05V
± 8.92E-10A
± 6.20E-09A
± 5.65E-09A
± 7.10E+02V/mV
± 1.10E+02V/mV
± 3.84E+00dB
± 1.83E-01dB
± 4.11E-01dB
± 2.53E-00dB
± 1.82E-04V
± 6.24E-04V
± 3.00E-03V
± 3.72E-04V
± 4.74E-04V
± 1.85E-03V
± 5.70E-04A
± 8.17E-04A
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Table C.5. Measured parameters, pre-irradiation specifications and measurement resolutions
for VS=3V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Measured Parameter
Positive Supply Current
Negative Supply Current
Input Offset Voltage
Input Offset Current
+ Input Bias Current
- Input Bias Current
Large Signal Voltage Gain (10kΩ Load)
Common Mode Rejection Ratio
Common Mode Rejection Ratio Matching
Output Voltage Swing High (No Load)
Output Voltage Swing High (ISOURCE=1mA)
Output Voltage Swing High (ISOURCE=2.5mA)
Output Voltage Swing Low (No Load)
Output Voltage Swing Low (ISINK=1mA)
Output Voltage Swing Low (ISINK=2.5mA)
+VS Short Circuit Current
-VS Short Circuit Current
8.8mA
-8.8mA
±800μV
±65nA
±650nA
±650nA
500V/mV
72dB
70dB
10mV
150mV
250mV
30mV
100mV
200mV
±12mA
±12mA
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± 1.39E-05A
± 2.13E-05A
± 4.53E-06V
± 6.63E-10A
± 4.87E-09A
± 5.59E-09A
± 2.16E+02V/mV
± 3.65E-01dB
± 8.62E-02dB
± 1.59E-04V
± 1.95E-04V
± 4.07E-04V
± 2.04E-04V
± 1.91E-04V
± 3.99E-04V
± 1.81E-05A
± 7.36E-05A
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Table C.6. Measured parameters, pre-irradiation specifications and measurement resolutions
for VS=5V.
Pre-Irradiation
Measurement
Specification
Resolution/Precision
Measured Parameter
Positive Supply Current
Negative Supply Current
Input Offset Voltage
Input Offset Current
+ Input Bias Current
- Input Bias Current
Large Signal Voltage Gain (10kΩ Load)
Common Mode Rejection Ratio
Common Mode Rejection Ratio Matching
Power Supply Rejection Ratio
Power Supply Rejection Ratio Matching
Output Voltage Swing High (No Load)
Output Voltage Swing High (ISOURCE=1mA)
Output Voltage Swing High (ISOURCE=2.5mA)
Output Voltage Swing Low (No Load)
Output Voltage Swing Low (ISINK=1mA)
Output Voltage Swing Low (ISINK=2.5mA)
+VS Short Circuit Current
-VS Short Circuit Current
8.8mA
-8.8mA
±800μV
±65nA
±650nA
±650nA
600V/mV
76dB
75dB
88dB
82dB
10mV
150mV
250mV
30mV
100mV
200mV
±12.5mA
±12.5mA
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± 3.51E-05A
± 3.54E-05A
± 7.82E-06V
± 5.95E-10A
± 6.87E-09A
± 7.29E-09A
± 7.14E+02V/mV
± 1.04E-00dB
± 1.62E-01dB
± 4.84E-00dB
± 1.76E-00dB
± 1.76E-04V
± 3.07E-04V
± 4.42E-04V
± 1.75E-04V
± 1.84E-04V
± 4.18E-04V
± 4.44E-05A
±1.40E-04A
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Appendix D: List of Figures used in Section 5 (ELDRS Test Results)
5.1
5.2
5.3
5.4
5.5
5.6
5.7
5.8
5.9
5.10
5.11
5.12
5.13
5.14
5.15
5.16
5.17
5.18
5.19
5.20
5.21
5.22
5.23
5.24
5.25
5.26
5.27
5.28
5.29
5.30
5.31
5.32
5.33
5.34
5.35
5.36
5.37
5.38
5.39
Positive Supply Current (A)
Negative Supply Current (A)
Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V)
Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V)
Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V)
Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V)
Input Offset Current @ +/- 15V, VCM= 0 V #1 (A)
Input Offset Current @ +/- 15V, VCM= 0 V #2 (A)
Input Offset Current @ +/- 15V, VCM= 0 V #3 (A)
Input Offset Current @ +/- 15V, VCM= 0 V #4 (A)
Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A)
Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A)
Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A)
Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A)
Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A)
Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A)
Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V)
Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V)
Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V)
Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V)
Input Offset Current @ +/- 15V, VCM= 15 V #1 (A)
Input Offset Current @ +/- 15V, VCM= 15 V #2 (A)
Input Offset Current @ +/- 15V, VCM= 15 V #3 (A)
Input Offset Current @ +/- 15V, VCM= 15 V #4 (A)
Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A)
Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A)
Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A)
Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A)
Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A)
Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A)
Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V)
Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V)
Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V)
Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V)
Input Offset Current @ +/- 15V, VCM= -15 V #1 (A)
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5.40
5.41
5.42
5.43
5.44
5.45
5.46
5.47
5.48
5.49
5.50
5.51
5.52
5.53
5.54
5.55
5.56
5.57
5.58
5.59
5.60
5.61
5.62
5.63
5.64
5.65
5.66
5.67
5.68
5.69
5.70
5.71
5.72
5.73
5.74
5.75
5.76
5.77
5.78
5.79
5.80
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Input Offset Current @ +/- 15V, VCM= -15 V #2 (A)
Input Offset Current @ +/- 15V, VCM= -15 V #3 (A)
Input Offset Current @ +/- 15V, VCM= -15 V #4 (A)
Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A)
Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A)
Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A)
Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A)
Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A)
Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A)
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV)
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV)
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV)
Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV)
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV)
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV)
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV)
Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV)
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB)
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB)
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB)
Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB)
Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB)
Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB)
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB)
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB)
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB)
Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB)
Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB)
Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB)
Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V)
Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V)
Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V)
Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V)
Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V)
Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V)
Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V)
Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V)
Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V)
Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V)
An ISO 9001:2000 Certified Company
558
ELDRS Report
08-133 090622 R1.2
5.81
5.82
5.83
5.84
5.85
5.86
5.87
5.88
5.89
5.90
5.91
5.92
5.93
5.94
5.95
5.96
5.97
5.98
5.99
5.100
5.101
5.102
5.103
5.104
5.105
5.106
5.107
5.108
5.109
5.110
5.111
5.112
5.113
5.114
5.115
5.116
5.117
5.118
5.119
5.120
5.121
Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V)
Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V)
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V)
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V)
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V)
Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V)
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V)
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V)
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V)
Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V)
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V)
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V)
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V)
Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V)
Positive Short-Circuit Current @ +/- 15 V #1 (A)
Positive Short-Circuit Current @ +/- 15 V #2 (A)
Positive Short-Circuit Current @ +/- 15 V #3 (A)
Positive Short-Circuit Current @ +/- 15 V #4 (A)
Negative Short-Circuit Current @ +/- 15 V #1 (A)
Negative Short-Circuit Current @ +/- 15 V #2 (A)
Negative Short-Circuit Current @ +/- 15 V #3 (A)
Negative Short-Circuit Current @ +/- 15 V #4 (A)
Positive Supply Current @ 3V (A)
Negative Supply Current @ 3V (A)
Input Offset Voltage @ 3V, VCM=0V #1 (V)
Input Offset Voltage @ 3V, VCM=0V #2 (V)
Input Offset Voltage @ 3V, VCM=0V #3 (V)
Input Offset Voltage @ 3V, VCM=0V #4 (V)
Input Offset Current @ 3V, VCM=0V #1 (A)
Input Offset Current @ 3V, VCM=0V #2 (A)
Input Offset Current @ 3V, VCM=0V #3 (A)
Input Offset Current @ 3V, VCM=0V #4 (A)
Positive Input Bias Current @ 3V, VCM=0V #1 (A)
Positive Input Bias Current @ 3V, VCM=0V #2 (A)
Positive Input Bias Current @ 3V, VCM=0V #3 (A)
Positive Input Bias Current @ 3V, VCM=0V #4 (A)
Negative Input Bias Current @ 3V, VCM=0V #1 (A)
Negative Input Bias Current @ 3V, VCM=0V #2 (A)
Negative Input Bias Current @ 3V, VCM=0V #3 (A)
Negative Input Bias Current @ 3V, VCM=0V #4 (A)
Input Offset Voltage @ 3V, VCM=3V #1 (V)
An ISO 9001:2000 Certified Company
559
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
5.122
5.123
5.124
5.125
5.126
5.127
5.128
5.129
5.130
5.131
5.132
5.133
5.134
5.135
5.136
5.137
5.138
5.139
5.140
5.141
5.142
5.143
5.144
5.145
5.146
5.147
5.148
5.149
5.150
5.151
5.152
5.153
5.154
5.155
5.156
5.157
5.158
5.159
5.160
5.161
5.162
Input Offset Voltage @ 3V, VCM=3V #2 (V)
Input Offset Voltage @ 3V, VCM=3V #3 (V)
Input Offset Voltage @ 3V, VCM=3V #4 (V)
Input Offset Current @ 3V, VCM=3V #1 (A)
Input Offset Current @ 3V, VCM=3V #2 (A)
Input Offset Current @ 3V, VCM=3V #3 (A)
Input Offset Current @ 3V, VCM=3V #4 (A)
Positive Input Bias Current @ 3V, VCM=3V #1 (A)
Positive Input Bias Current @ 3V, VCM=3V #2 (A)
Positive Input Bias Current @ 3V, VCM=3V #3 (A)
Positive Input Bias Current @ 3V, VCM=3V #4 (A)
Negative Input Bias Current @ 3V, VCM=3V #1 (A)
Negative Input Bias Current @ 3V, VCM=3V #2 (A)
Negative Input Bias Current @ 3V, VCM=3V #3 (A)
Negative Input Bias Current @ 3V, VCM=3V #4 (A)
Large Signal Voltage Gain @ 3V #1 (V/mV)
Large Signal Voltage Gain @ 3V #2 (V/mV)
Large Signal Voltage Gain @ 3V #3 (V/mV)
Large Signal Voltage Gain @ 3V #4 (V/mV)
Large Signal Voltage Gain @ 3V #1 (dB)
Large Signal Voltage Gain @ 3V #2 (dB)
Large Signal Voltage Gain @ 3V #3 (dB)
Large Signal Voltage Gain @ 3V #4 (dB)
Common Mode Rejection Ratio @ 3V #1 (dB)
Common Mode Rejection Ratio @ 3V #2 (dB)
Common Mode Rejection Ratio @ 3V #3 (dB)
Common Mode Rejection Ratio @ 3V #4 (dB)
Common Mode Rejection Ratio Matching 1-4 @ 3V (dB)
Common Mode Rejection Ratio Matching 2-3 @ 3V (dB)
Output Voltage Swing High IL= 0mA @ 3V #1 (V)
Output Voltage Swing High IL= 0mA @ 3V #2 (V)
Output Voltage Swing High IL= 0mA @ 3V #3 (V)
Output Voltage Swing High IL= 0mA @ 3V #4 (V)
Output Voltage Swing High IL= 1mA @ 3V #1 (V)
Output Voltage Swing High IL= 1mA @ 3V #2 (V)
Output Voltage Swing High IL= 1mA @ 3V #3 (V)
Output Voltage Swing High IL= 1mA @ 3V #4 (V)
Output Voltage Swing High IL= 2.5mA @ 3V #1 (V)
Output Voltage Swing High IL= 2.5mA @ 3V #2 (V)
Output Voltage Swing High IL= 2.5mA @ 3V #3 (V)
Output Voltage Swing High IL= 2.5mA @ 3V #4 (V)
An ISO 9001:2000 Certified Company
560
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
5.163
5.164
5.165
5.166
5.167
5.168
5.169
5.170
5.171
5.172
5.173
5.174
5.175
5.176
5.177
5.178
5.179
5.180
5.181
5.182
5.183
5.184
5.185
5.186
5.187
5.188
5.189
5.190
5.191
5.192
5.193
5.194
5.195
5.196
5.197
5.198
5.199
5.200
5.201
5.202
5.203
Output Voltage Swing Low IL= 0mA @ 3V #1 (V)
Output Voltage Swing Low IL= 0mA @ 3V #2 (V)
Output Voltage Swing Low IL= 0mA @ 3V #3 (V)
Output Voltage Swing Low IL= 0mA @ 3V #4 (V)
Output Voltage Swing Low IL= 1mA @ 3V #1 (V)
Output Voltage Swing Low IL= 1mA @ 3V #2 (V)
Output Voltage Swing Low IL= 1mA @ 3V #3 (V)
Output Voltage Swing Low IL= 1mA @ 3V #4 (V)
Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V)
Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V)
Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V)
Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V)
Positive Short-Circuit Current @ 3V #1 (A)
Positive Short-Circuit Current @ 3V #2 (A)
Positive Short-Circuit Current @ 3V #3 (A)
Positive Short-Circuit Current @ 3V #4 (A)
Negative Short-Circuit Current @ 3V #1 (A)
Negative Short-Circuit Current @ 3V #2 (A)
Negative Short-Circuit Current @ 3V #3 (A)
Negative Short-Circuit Current @ 3V #4 (A)
Positive Supply Current @ 5V (A)
Negative Supply Current @ 5V (A)
Input Offset Voltage @ 5V, VCM=0V #1 (V)
Input Offset Voltage @ 5V, VCM=0V #2 (V)
Input Offset Voltage @ 5V, VCM=0V #3 (V)
Input Offset Voltage @ 5V, VCM=0V #4 (V)
Input Offset Current @ 5V, VCM=0V #1 (A)
Input Offset Current @ 5V, VCM=0V #2 (A)
Input Offset Current @ 5V, VCM=0V #3 (A)
Input Offset Current @ 5V, VCM=0V #4 (A)
Positive Input Bias Current @ 5V, VCM=0V #1 (A)
Positive Input Bias Current @ 5V, VCM=0V #2 (A)
Positive Input Bias Current @ 5V, VCM=0V #3 (A)
Positive Input Bias Current @ 5V, VCM=0V #4 (A)
Negative Input Bias Current @ 5V, VCM=0V #1 (A)
Negative Input Bias Current @ 5V, VCM=0V #2 (A)
Negative Input Bias Current @ 5V, VCM=0V #3 (A)
Negative Input Bias Current @ 5V, VCM=0V #4 (A)
Input Offset Voltage @ 5V, VCM=5V #1 (V)
Input Offset Voltage @ 5V, VCM=5V #2 (V)
Input Offset Voltage @ 5V, VCM=5V #3 (V)
An ISO 9001:2000 Certified Company
561
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
5.204
5.205
5.206
5.207
5.208
5.209
5.210
5.211
5.212
5.213
5.214
5.215
5.216
5.217
5.218
5.219
5.220
5.221
5.222
5.223
5.224
5.225
5.226
5.227
5.228
5.229
5.230
5.231
5.232
5.233
5.234
5.235
5.236
5.237
5.238
5.239
5.240
5.241
5.242
5.243
5.244
Input Offset Voltage @ 5V, VCM=5V #4 (V)
Input Offset Current @ 5V, VCM=5V #1 (A)
Input Offset Current @ 5V, VCM=5V #2 (A)
Input Offset Current @ 5V, VCM=5V #3 (A)
Input Offset Current @ 5V, VCM=5V #4 (A)
Positive Input Bias Current @ 5V, VCM=5V #1 (A)
Positive Input Bias Current @ 5V, VCM=5V #2 (A)
Positive Input Bias Current @ 5V, VCM=5V #3 (A)
Positive Input Bias Current @ 5V, VCM=5V #4 (A)
Negative Input Bias Current @ 5V, VCM=5V #1 (A)
Negative Input Bias Current @ 5V, VCM=5V #2 (A)
Negative Input Bias Current @ 5V, VCM=5V #3 (A)
Negative Input Bias Current @ 5V, VCM=5V #4 (A)
Large Signal Voltage Gain @ 5V #1 (V/mV)
Large Signal Voltage Gain @ 5V #2 (V/mV)
Large Signal Voltage Gain @ 5V #3 (V/mV)
Large Signal Voltage Gain @ 5V #4 (V/mV)
Large Signal Voltage Gain @ 5V #1 (dB)
Large Signal Voltage Gain @ 5V #2 (dB)
Large Signal Voltage Gain @ 5V #3 (dB)
Large Signal Voltage Gain @ 5V #4 (dB)
Common Mode Rejection Ratio @ 5V #1 (dB)
Common Mode Rejection Ratio @ 5V #2 (dB)
Common Mode Rejection Ratio @ 5V #3 (dB)
Common Mode Rejection Ratio @ 5V #4 (dB)
Common Mode Rejection Ratio Matching 1-4 @ 5V (dB)
Common Mode Rejection Ratio Matching 2-3 @ 5V (dB)
Power Supply Rejection Ratio @ 2.2V-12V #1 (dB)
Power Supply Rejection Ratio @ 2.2V-12V #2 (dB)
Power Supply Rejection Ratio @ 2.2V-12V #3 (dB)
Power Supply Rejection Ratio @ 2.2V-12V #4 (dB)
Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB)
Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB)
Output Voltage Swing High IL= 0mA @ 5V #1 (V)
Output Voltage Swing High IL= 0mA @ 5V #2 (V)
Output Voltage Swing High IL= 0mA @ 5V #3 (V)
Output Voltage Swing High IL= 0mA @ 5V #4 (V)
Output Voltage Swing High IL= 1mA @ 5V #1 (V)
Output Voltage Swing High IL= 1mA @ 5V #2 (V)
Output Voltage Swing High IL= 1mA @ 5V #3 (V)
Output Voltage Swing High IL= 1mA @ 5V #4 (V)
An ISO 9001:2000 Certified Company
562
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Report
08-133 090622 R1.2
5.245
5.246
5.247
5.248
5.249
5.250
5.251
5.252
5.253
5.254
5.255
5.256
5.257
5.258
5.259
5.260
5.261
5.262
5.263
5.264
5.265
5.266
5.267
5.268
Output Voltage Swing High IL= 2.5mA @ 5V #1 (V)
Output Voltage Swing High IL= 2.5mA @ 5V #2 (V)
Output Voltage Swing High IL= 2.5mA @ 5V #3 (V)
Output Voltage Swing High IL= 2.5mA @ 5V #4 (V)
Output Voltage Swing Low IL= 0mA @ 5V #1 (V)
Output Voltage Swing Low IL= 0mA @ 5V #2 (V)
Output Voltage Swing Low IL= 0mA @ 5V #3 (V)
Output Voltage Swing Low IL= 0mA @ 5V #4 (V)
Output Voltage Swing Low IL= 1mA @ 5V #1 (V)
Output Voltage Swing Low IL= 1mA @ 5V #2 (V)
Output Voltage Swing Low IL= 1mA @ 5V #3 (V)
Output Voltage Swing Low IL= 1mA @ 5V #4 (V)
Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V)
Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V)
Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V)
Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V)
Positive Short-Circuit Current @ 5V #1 (A)
Positive Short-Circuit Current @ 5V #2 (A)
Positive Short-Circuit Current @ 5V #3 (A)
Positive Short-Circuit Current @ 5V #4 (A)
Negative Short-Circuit Current @ 5V #1 (A)
Negative Short-Circuit Current @ 5V #2 (A)
Negative Short-Circuit Current @ 5V #3 (A)
Negative Short-Circuit Current @ 5V #4 (A)
An ISO 9001:2000 Certified Company
563
Radiation Assured Devices
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
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