ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH1499MW Quad Precision Op Amp for Linear Technology Customer: Linear Technology (PO# 49797L) RAD Job Number: 08-133 Part Type Tested: Linear Technology RH1499MW Quad Precision Op Amp Commercial Part Number: RH1499MW Traceability Information: Lot Date Code: 0731A, FAB W10737593.1, Wafer 19, LOT 447411.1 (Obtained from Linear Technology PO 49797L). See photograph of unit under test in Appendix A. Quantity of Units: 11 units total, 5 units for biased irradiation, 5 units for unbiased irradiation and 1 control unit. Serial numbers 866-870 were biased during irradiation, serial numbers 871-874 and 876 were unbiased during irradiation and serial number 877 was used as the control. See Appendix B for the radiation bias connection table. External Traveler: None Required Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD. TID Dose Rate and Test Increments: 10mrad(Si)/s with readings at pre-irradiation, 10, 20, 30 and 50krad(Si). TID Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a 168hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the irradiations. Electrical measurements shall be made following each anneal increment. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition D TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture and RH1499 BGSS-061114 DUT Board Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the GB-150 low dose rate Co60 source. Dosimetry performed by CaF TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5 Irradiation and Test Temperature: All irradiations and electrical tests performed at room temperature controlled to 24°C ± 6°C per MIL STD 883. ELDRS Test Result: PASSED to 30krad(Si) but FAILED at 50krad(Si) due to degradation of the output voltage swing and short circuit current for the singlesided 3V supply condition and the power supply rejection ratio at the singlesided 2.2V to 12V supply range An ISO 9001:2000 Certified Company 1 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6μm and smaller) the bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local oxidation of silicon (LOCOS) oxides (also known as “birds-beak” oxides). However, many linear and mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting susceptibility to ELDRS or simulating the low dose rate sensitivity with a “conventional” room temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883G TM 1019.7). Over the past 10 years a number of accelerating techniques have been examined, including an elevated temperature anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating at various temperatures. However, none of these techniques have proven useful across the wide variety of linear and/or mixed signal devices used in spaceborne applications. The latest requirement incorporated in MIL-STD-883G TM 1019.7 requires that devices that could potentially exhibit ELDRS “shall be tested either at the intended application dose rate, at a prescribed low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature irradiation test that includes a parameter delta design margin”. While the recently released MIL-STD883 TM 1019.7 allows for accelerated testing, the requirements for this are to essentially perform a low dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to meet the requirements of MIL-STD-883G TM 1019.7 Condition D, we have performed an ELDRS test at 10mrad(Si)/s. 2.0. Radiation Test Apparatus The ELDRS testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The ELDRS source is a GB-150 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s as determined by the distance from the source. For the low dose rate ELDRS testing described in this report, the devices are placed approximately 2-meters from the Co-60 rods. The irradiator calibration is maintained by Radiation Assured Devices’ Longmire Laboratories using thermoluminescent dosimeters (TLDs) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the Co-60 irradiator at RAD’s Longmire Laboratory facility. An ISO 9001:2000 Certified Company 2 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 50rad(Si)/s close to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters. An ISO 9001:2000 Certified Company 3 ELDRS Report 08-133 090622 R1.2 3.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Test Conditions The RH1499MW Quad operational amplifier described in this final report was irradiated using two bias conditions, statically biased with a split 15V supply and all pins tied to ground, see Appendix A for details on biasing conditions during the radiation exposure. These devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental readings at 10, 20, 30 and 50krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The ELDRS bias board was positioned in the Co-60 cell to provide the required 10mrad(Si)/s and was located inside a lead-aluminum box. The lead-aluminum box is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by low-energy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the lead-aluminum box was determined based on TLD dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose rate for this work was 10.0mrad(Si)/s with a precision of ±5%. An ISO 9001:2000 Certified Company 4 ELDRS Report 08-133 090622 R1.2 4.0. Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Tested Parameters During the radiation lot acceptance testing the following pre- and post-irradiation electrical parameters were measured (note that the full set of test conditions for the parameters listed below are shown in Appendix B): Measured parameters and test conditions for VS=±15V: 1. Positive Supply Current 2. Negative Supply Current 3. Input Offset Voltage (Op Amp 1-4) 4. Input Offset Current (Op Amp 1-4) 5. + Input Bias Current (Op Amp 1-4) 6. - Input Bias Current (Op Amp 1-4) 7. Input Offset Voltage (Op Amp 1-4) 8. Input Offset Current (Op Amp 1-4) 9. + Input Bias Current (Op Amp 1-4) 10. - Input Bias Current (Op Amp 1-4) 11. Input Offset Voltage (Op Amp 1-4) 12. Input Offset Current (Op Amp 1-4) 13. + Input Bias Current (Op Amp 1-4) 14. - Input Bias Current (Op Amp 1-4) 15. Large Signal Voltage Gain (Op Amp 1-4) 16. Large Signal Voltage Gain (Op Amp 1-4) 17. CMRR (Op Amp 1-4) 18. CMRR Matching 1-4 19. CMRR Matching 2-3 20. PSRR (Op Amp 1-4) 21. PSRR Matching 1-4 22. PSRR Matching 2-3 23. Output Voltage Swing High (Op Amp 1-4) 24. Output Voltage Swing High (Op Amp 1-4) 25. Output Voltage Swing High (Op Amp 1-4) 26. Output Voltage Swing Low (Op Amp 1-4) 27. Output Voltage Swing Low (Op Amp 1-4) 28. Output Voltage Swing Low (Op Amp 1-4) 29. +VS Short-Circuit Current (Op Amp 1-4) 30. -VS Short-Circuit Current (Op Amp 1-4) Measured parameters and test conditions for VS=3V: 31. Positive Supply Current An ISO 9001:2000 Certified Company 5 ELDRS Report 08-133 090622 R1.2 32. Negative Supply Current 33. Input Offset Voltage (Op Amp 1-4) 34. Input Offset Current (Op Amp 1-4) 35. + Input Bias Current (Op Amp 1-4) 36. - Input Bias Current (Op Amp 1-4) 37. Input Offset Voltage (Op Amp 1-4) 38. Input Offset Current (Op Amp 1-4) 39. + Input Bias Current (Op Amp 1-4) 40. - Input Bias Current (Op Amp 1-4) 41. Large Signal Voltage Gain (Op Amp 1-4) 42. CMRR (Op Amp 1-4) 43. CMRR Matching 1-4 44. CMRR Matching 2-3 45. Output Voltage Swing High (Op Amp 1-4) 46. Output Voltage Swing High (Op Amp 1-4) 47. Output Voltage Swing High (Op Amp 1-4) 48. Output Voltage Swing Low (Op Amp 1-4) 49. Output Voltage Swing Low (Op Amp 1-4) 50. Output Voltage Swing Low (Op Amp 1-4) 51. +VS Short-Circuit Current (Op Amp 1-4) 52. -VS Short-Circuit Current (Op Amp 1-4) Measured parameters and test conditions for VS=5V: 53. Positive Supply Current 54. Negative Supply Current 55. Input Offset Voltage (Op Amp 1-4) 56. Input Offset Voltage (Op Amp 1-4) 57. Input Offset Current (Op Amp 1-4) 58. Input Offset Current (Op Amp 1-4) 59. + Input Bias Current (Op Amp 1-4) 60. + Input Bias Current (Op Amp 1-4) 61. - Input Bias Current (Op Amp 1-4) 62. - Input Bias Current (Op Amp 1-4) 63. Large Signal Voltage Gain (Op Amp 1-4) 64. CMRR (Op Amp 1-4) 65. CMRR Matching 1-4 66. CMRR Matching 2-3 67. PSRR (Op Amp 1-4) 68. PSRR Matching 1-4 69. PSRR Matching 2-3 An ISO 9001:2000 Certified Company 6 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 70. Output Voltage Swing High (Op Amp 1-4) 71. Output Voltage Swing High (Op Amp 1-4) 72. Output Voltage Swing High (Op Amp 1-4) 73. Output Voltage Swing Low (Op Amp 1-4) 74. Output Voltage Swing Low (Op Amp 1-4) 75. Output Voltage Swing Low (Op Amp 1-4) 76. +VS Short Circuit Current (Op Amp 1-4) 77. -VS Short Circuit Current (Op Amp 1-4) Appendix C details the measured parameters, test conditions, pre-irradiation specification and measurement resolution for each of the measurements. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary are contained in this report as well as in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL values used is 2.742 per MIL HDBK 814 using one sided tolerance limits of 90/90 and a 5-piece sample size. This survival probability/level of confidence is consistent with a 22-piece sample size and zero failures analyzed using a lot tolerance percent defective (LTPD) approach. Note that the following criteria must be met for a device to pass the ELDRS testing: following the radiation exposure the unit shall pass the specification value and the average value for the each device must pass the specification value when the KTL limits are applied. If either of these conditions is not satisfied following the radiation exposure, then the lot could be logged as an RLAT failure. Further, MIL-STD-883G, TM 1019.7 Section 3.13.1.1 Characterization test to determine if a part exhibits ELDRS” states the following: Select a minimum random sample of 21 devices from a population representative of recent production runs. Smaller sample sizes may be used if agreed upon between the parties to the test. All of the selected devices shall have undergone appropriate elevated temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and repeat the electrical characterization on each part at each dose level. Post irradiation electrical measurements shall be performed per paragraph 3.10 where the low dose rate test is considered Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5 for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test An ISO 9001:2000 Certified Company 7 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 does not apply to parameters which exhibit changes that are within experimental error or whose values are below the pre-irradiation electrical specification limits at low dose rate at the specification dose. Therefore, the data in this report can be analyzed along with the high dose rate report titled “Radiation Lot Acceptance Test (RLAT) of the RH1499MW Quad Operational Amplifier for Linear Technology” to demonstrate that these parts do not exhibit ELDRS as defined in the current test method. 5.0. ELDRS Test Results Using the conditions stated above, the RH1499MW devices passed the ELDRS test to 30krad(Si) but failed at 50krad(Si) due to degradation of the output voltage swing and short circuit current for the single-sided 3V supply condition and power supply rejection ratio at the single-sided 2.2V to 12V supply range. Most measured parameters showed no significant degradation with radiation and all parameters passed to 50krad(Si) when tested using the 15V split supply condition. Figures 5.1 through 5.268 show plots of all the measured parameters versus total ionizing dose. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. Tables 5.1 through 5.268 show the raw data, averages, standard deviation, +KTL statistics, -KTL statistics, specification limit and Pass/Fail condition for each parameter. Appendix D provides a list of all the figures in this results section to facilitate the location of a particular parameter. As seen clearly in these tables and figures, the pre- and post-irradiation data are well within the specification even after application of the KTL statistics (with certain exceptions, as noted below). The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained under control during the course of the testing. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Unfortunately, not all measured parameters are well suited to this approach due to inherent large variations. The parameters measured in this report where the preirradiation KTL values are out of specification include Common Mode Rejection Ratio, Power Supply Rejection Ratio and Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation and a statistical error often greater than the measured value. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 8 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.10E-02 Positive Supply Current (A) 1.00E-02 9.00E-03 8.00E-03 7.00E-03 6.00E-03 5.00E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.1. Plot of Positive Supply Current (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 9 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.1. Raw data for Positive Supply Current (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.46E-03 7.29E-03 7.41E-03 7.09E-03 7.24E-03 7.29E-03 7.38E-03 7.58E-03 7.22E-03 7.37E-03 7.29E-03 10 7.20E-03 7.26E-03 7.35E-03 6.99E-03 7.18E-03 7.23E-03 7.32E-03 7.52E-03 7.15E-03 7.30E-03 7.25E-03 20 7.15E-03 7.22E-03 7.32E-03 6.95E-03 7.14E-03 7.22E-03 7.30E-03 7.51E-03 7.12E-03 7.29E-03 7.24E-03 30 7.15E-03 7.22E-03 7.32E-03 6.94E-03 7.13E-03 7.20E-03 7.29E-03 7.49E-03 7.11E-03 7.28E-03 7.25E-03 50 7.05E-03 7.15E-03 7.26E-03 6.86E-03 7.06E-03 7.17E-03 7.25E-03 7.47E-03 7.08E-03 7.25E-03 7.26E-03 60 7.16E-03 7.24E-03 7.33E-03 6.96E-03 7.14E-03 7.19E-03 7.28E-03 7.50E-03 7.10E-03 7.27E-03 7.23E-03 70 7.16E-03 7.24E-03 7.33E-03 6.96E-03 7.14E-03 7.19E-03 7.28E-03 7.50E-03 7.10E-03 7.27E-03 7.23E-03 7.30E-03 1.46E-04 7.70E-03 6.90E-03 7.20E-03 1.33E-04 7.56E-03 6.83E-03 7.16E-03 1.36E-04 7.53E-03 6.78E-03 7.15E-03 1.40E-04 7.54E-03 6.77E-03 7.08E-03 1.47E-04 7.48E-03 6.67E-03 7.17E-03 1.37E-04 7.54E-03 6.79E-03 7.17E-03 1.37E-04 7.54E-03 6.79E-03 7.37E-03 1.35E-04 7.74E-03 7.00E-03 1.00E-02 PASS 7.30E-03 1.38E-04 7.68E-03 6.93E-03 1.00E-02 PASS 7.29E-03 1.43E-04 7.68E-03 6.89E-03 1.00E-02 PASS 7.27E-03 1.41E-04 7.66E-03 6.89E-03 1.00E-02 PASS 7.24E-03 1.44E-04 7.64E-03 6.85E-03 1.00E-02 PASS 7.27E-03 1.49E-04 7.68E-03 6.86E-03 1.00E-02 PASS 7.27E-03 1.49E-04 7.68E-03 6.86E-03 1.00E-02 PASS An ISO 9001:2000 Certified Company 10 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased -5.00E-03 Negative Supply Current (A) -6.00E-03 -7.00E-03 -8.00E-03 -9.00E-03 -1.00E-02 -1.10E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.2. Plot of Negative Supply Current (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 11 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.2. Raw data for Negative Supply Current (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -7.47E-03 -7.31E-03 -7.42E-03 -7.11E-03 -7.26E-03 -7.31E-03 -7.40E-03 -7.59E-03 -7.23E-03 -7.38E-03 -7.31E-03 10 -7.22E-03 -7.28E-03 -7.37E-03 -7.00E-03 -7.20E-03 -7.25E-03 -7.34E-03 -7.55E-03 -7.16E-03 -7.32E-03 -7.26E-03 20 -7.17E-03 -7.24E-03 -7.33E-03 -6.97E-03 -7.16E-03 -7.24E-03 -7.31E-03 -7.53E-03 -7.14E-03 -7.30E-03 -7.26E-03 30 -7.17E-03 -7.24E-03 -7.34E-03 -6.95E-03 -7.15E-03 -7.22E-03 -7.30E-03 -7.51E-03 -7.13E-03 -7.29E-03 -7.28E-03 50 -7.07E-03 -7.17E-03 -7.27E-03 -6.87E-03 -7.07E-03 -7.19E-03 -7.28E-03 -7.49E-03 -7.10E-03 -7.26E-03 -7.28E-03 60 -7.17E-03 -7.25E-03 -7.34E-03 -6.97E-03 -7.16E-03 -7.21E-03 -7.30E-03 -7.52E-03 -7.12E-03 -7.29E-03 -7.25E-03 70 -7.17E-03 -7.25E-03 -7.34E-03 -6.97E-03 -7.16E-03 -7.21E-03 -7.30E-03 -7.52E-03 -7.12E-03 -7.29E-03 -7.25E-03 -7.31E-03 1.42E-04 -6.93E-03 -7.70E-03 -7.21E-03 1.37E-04 -6.84E-03 -7.59E-03 -7.17E-03 1.33E-04 -6.81E-03 -7.54E-03 -7.17E-03 1.44E-04 -6.78E-03 -7.56E-03 -7.09E-03 1.48E-04 -6.68E-03 -7.50E-03 -7.18E-03 1.37E-04 -6.80E-03 -7.55E-03 -7.18E-03 1.37E-04 -6.80E-03 -7.55E-03 -7.38E-03 1.34E-04 -7.01E-03 -7.75E-03 -1.00E-02 PASS -7.32E-03 1.45E-04 -6.93E-03 -7.72E-03 -1.00E-02 PASS -7.30E-03 1.43E-04 -6.91E-03 -7.70E-03 -1.00E-02 PASS -7.29E-03 1.41E-04 -6.90E-03 -7.68E-03 -1.00E-02 PASS -7.26E-03 1.45E-04 -6.87E-03 -7.66E-03 -1.00E-02 PASS -7.29E-03 1.49E-04 -6.88E-03 -7.70E-03 -1.00E-02 PASS -7.29E-03 1.49E-04 -6.88E-03 -7.70E-03 -1.00E-02 PASS An ISO 9001:2000 Certified Company 12 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.3. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 13 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.3. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.92E-04 -5.71E-05 -3.37E-04 6.50E-05 -1.86E-04 -1.77E-04 -2.69E-04 -9.02E-06 -1.55E-04 -7.59E-05 -3.73E-04 10 -2.02E-04 -7.85E-05 -3.57E-04 5.09E-05 -2.08E-04 -1.88E-04 -2.77E-04 -2.78E-05 -1.65E-04 -8.77E-05 -3.74E-04 20 -1.87E-04 -8.44E-05 -3.54E-04 6.25E-05 -2.03E-04 -1.86E-04 -2.81E-04 -2.74E-05 -1.65E-04 -8.61E-05 -3.75E-04 30 -1.79E-04 -8.89E-05 -3.54E-04 6.41E-05 -1.95E-04 -1.91E-04 -2.81E-04 -3.19E-05 -1.65E-04 -8.32E-05 -3.75E-04 50 -1.78E-04 -9.41E-05 -3.60E-04 6.73E-05 -1.91E-04 -1.89E-04 -2.79E-04 -2.90E-05 -1.68E-04 -8.25E-05 -3.75E-04 60 -1.76E-04 -9.22E-05 -3.61E-04 7.73E-05 -1.90E-04 -1.87E-04 -2.78E-04 -2.70E-05 -1.68E-04 -8.16E-05 -3.76E-04 70 -1.76E-04 -9.22E-05 -3.61E-04 7.73E-05 -1.90E-04 -1.87E-04 -2.78E-04 -2.70E-05 -1.68E-04 -8.16E-05 -3.76E-04 -1.41E-04 1.52E-04 2.76E-04 -5.59E-04 -1.59E-04 1.53E-04 2.61E-04 -5.79E-04 -1.53E-04 1.54E-04 2.70E-04 -5.76E-04 -1.51E-04 1.53E-04 2.70E-04 -5.71E-04 -1.51E-04 1.55E-04 2.75E-04 -5.77E-04 -1.48E-04 1.59E-04 2.89E-04 -5.86E-04 -1.48E-04 1.59E-04 2.89E-04 -5.86E-04 -1.37E-04 9.94E-05 1.35E-04 -4.10E-04 -8.00E-04 PASS 8.00E-04 PASS -1.49E-04 9.56E-05 1.13E-04 -4.11E-04 -9.50E-04 PASS 9.50E-04 PASS -1.49E-04 9.70E-05 1.17E-04 -4.15E-04 -9.50E-04 PASS 9.50E-04 PASS -1.50E-04 9.68E-05 1.15E-04 -4.16E-04 -9.50E-04 PASS 9.50E-04 PASS -1.49E-04 9.71E-05 1.17E-04 -4.16E-04 -9.50E-04 PASS 9.50E-04 PASS -1.48E-04 9.74E-05 1.19E-04 -4.15E-04 -9.50E-04 PASS 9.50E-04 PASS -1.48E-04 9.74E-05 1.19E-04 -4.15E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 14 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.4. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 15 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.4. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.11E-04 -2.28E-05 1.25E-04 -1.11E-04 4.59E-05 -2.39E-04 1.06E-05 -2.06E-04 -3.42E-04 -1.88E-04 -3.55E-04 10 1.70E-04 -4.27E-05 1.13E-04 -1.27E-04 1.74E-05 -2.53E-04 4.87E-06 -2.16E-04 -3.41E-04 -2.01E-04 -3.59E-04 20 1.85E-04 -3.46E-05 1.18E-04 -1.14E-04 1.73E-05 -2.53E-04 5.11E-06 -2.13E-04 -3.40E-04 -2.02E-04 -3.59E-04 30 1.87E-04 -3.02E-05 1.22E-04 -1.10E-04 2.43E-05 -2.54E-04 6.07E-06 -2.13E-04 -3.41E-04 -2.03E-04 -3.59E-04 50 1.83E-04 -3.05E-05 1.23E-04 -1.09E-04 1.56E-05 -2.58E-04 6.44E-06 -2.16E-04 -3.48E-04 -2.04E-04 -3.62E-04 60 1.94E-04 -2.75E-05 1.28E-04 -9.61E-05 2.76E-05 -2.54E-04 7.40E-06 -2.15E-04 -3.45E-04 -2.03E-04 -3.63E-04 70 1.94E-04 -2.75E-05 1.28E-04 -9.61E-05 2.76E-05 -2.54E-04 7.40E-06 -2.15E-04 -3.45E-04 -2.03E-04 -3.63E-04 4.98E-05 1.25E-04 3.93E-04 -2.94E-04 2.61E-05 1.19E-04 3.52E-04 -3.00E-04 3.44E-05 1.19E-04 3.62E-04 -2.93E-04 3.87E-05 1.18E-04 3.63E-04 -2.85E-04 3.65E-05 1.17E-04 3.58E-04 -2.85E-04 4.51E-05 1.17E-04 3.65E-04 -2.75E-04 4.51E-05 1.17E-04 3.65E-04 -2.75E-04 -1.93E-04 1.28E-04 1.59E-04 -5.45E-04 -8.00E-04 PASS 8.00E-04 PASS -2.01E-04 1.28E-04 1.48E-04 -5.51E-04 -9.50E-04 PASS 9.50E-04 PASS -2.00E-04 1.27E-04 1.48E-04 -5.49E-04 -9.50E-04 PASS 9.50E-04 PASS -2.01E-04 1.28E-04 1.50E-04 -5.52E-04 -9.50E-04 PASS 9.50E-04 PASS -2.04E-04 1.30E-04 1.54E-04 -5.62E-04 -9.50E-04 PASS 9.50E-04 PASS -2.02E-04 1.29E-04 1.53E-04 -5.57E-04 -9.50E-04 PASS 9.50E-04 PASS -2.02E-04 1.29E-04 1.53E-04 -5.57E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 16 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.5. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 17 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.5. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.52E-04 -3.29E-04 9.10E-06 -1.51E-04 -1.81E-04 -2.33E-04 3.65E-05 -2.90E-04 -3.12E-04 -4.38E-05 -1.39E-04 10 -2.90E-04 -3.60E-04 -5.70E-07 -2.00E-04 -2.05E-04 -2.48E-04 2.90E-05 -3.04E-04 -3.23E-04 -5.34E-05 -1.41E-04 20 -2.90E-04 -3.61E-04 1.14E-05 -1.94E-04 -2.01E-04 -2.49E-04 2.73E-05 -3.01E-04 -3.21E-04 -5.02E-05 -1.41E-04 30 -2.92E-04 -3.61E-04 1.88E-05 -1.95E-04 -1.93E-04 -2.49E-04 2.72E-05 -3.01E-04 -3.20E-04 -5.14E-05 -1.41E-04 50 -3.02E-04 -3.72E-04 2.71E-05 -2.01E-04 -2.00E-04 -2.53E-04 2.96E-05 -3.00E-04 -3.19E-04 -4.70E-05 -1.40E-04 60 -2.98E-04 -3.67E-04 3.49E-05 -1.99E-04 -1.95E-04 -2.52E-04 3.03E-05 -3.00E-04 -3.18E-04 -4.72E-05 -1.41E-04 70 -2.98E-04 -3.67E-04 3.49E-05 -1.99E-04 -1.95E-04 -2.52E-04 3.03E-05 -3.00E-04 -3.18E-04 -4.72E-05 -1.41E-04 -1.81E-04 1.26E-04 1.66E-04 -5.27E-04 -2.11E-04 1.35E-04 1.59E-04 -5.82E-04 -2.07E-04 1.40E-04 1.77E-04 -5.91E-04 -2.05E-04 1.44E-04 1.89E-04 -5.98E-04 -2.09E-04 1.51E-04 2.04E-04 -6.23E-04 -2.05E-04 1.52E-04 2.12E-04 -6.22E-04 -2.05E-04 1.52E-04 2.12E-04 -6.22E-04 -1.69E-04 1.56E-04 2.59E-04 -5.96E-04 -8.00E-04 PASS 8.00E-04 PASS -1.80E-04 1.58E-04 2.54E-04 -6.13E-04 -9.50E-04 PASS 9.50E-04 PASS -1.79E-04 1.57E-04 2.53E-04 -6.10E-04 -9.50E-04 PASS 9.50E-04 PASS -1.79E-04 1.57E-04 2.51E-04 -6.09E-04 -9.50E-04 PASS 9.50E-04 PASS -1.78E-04 1.59E-04 2.57E-04 -6.13E-04 -9.50E-04 PASS 9.50E-04 PASS -1.77E-04 1.59E-04 2.57E-04 -6.12E-04 -9.50E-04 PASS 9.50E-04 PASS -1.77E-04 1.59E-04 2.57E-04 -6.12E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 18 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.6. Plot of Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 19 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.6. Raw data for Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -8.60E-05 9.49E-05 -5.22E-04 -1.13E-04 -1.66E-04 -1.60E-04 -3.43E-04 -5.14E-04 1.13E-06 -2.70E-04 -1.91E-04 10 -1.20E-04 8.25E-05 -5.45E-04 -1.32E-04 -1.88E-04 -1.69E-04 -3.48E-04 -5.44E-04 -1.01E-05 -2.75E-04 -1.98E-04 20 -1.10E-04 8.35E-05 -5.35E-04 -1.25E-04 -1.79E-04 -1.68E-04 -3.44E-04 -5.43E-04 -1.19E-05 -2.77E-04 -1.96E-04 30 -1.03E-04 8.57E-05 -5.35E-04 -1.22E-04 -1.73E-04 -1.68E-04 -3.45E-04 -5.44E-04 -1.01E-05 -2.79E-04 -1.96E-04 50 -9.70E-05 8.18E-05 -5.36E-04 -1.20E-04 -1.72E-04 -1.71E-04 -3.45E-04 -5.47E-04 -1.20E-05 -2.79E-04 -1.97E-04 60 -9.00E-05 9.18E-05 -5.42E-04 -1.22E-04 -1.69E-04 -1.69E-04 -3.47E-04 -5.42E-04 -7.70E-06 -2.78E-04 -1.99E-04 70 -9.00E-05 9.18E-05 -5.42E-04 -1.22E-04 -1.69E-04 -1.69E-04 -3.47E-04 -5.42E-04 -7.70E-06 -2.78E-04 -1.99E-04 -1.58E-04 2.25E-04 4.60E-04 -7.77E-04 -1.80E-04 2.28E-04 4.45E-04 -8.06E-04 -1.73E-04 2.25E-04 4.45E-04 -7.91E-04 -1.69E-04 2.27E-04 4.52E-04 -7.91E-04 -1.69E-04 2.27E-04 4.53E-04 -7.90E-04 -1.66E-04 2.32E-04 4.70E-04 -8.03E-04 -1.66E-04 2.32E-04 4.70E-04 -8.03E-04 -2.57E-04 1.93E-04 2.73E-04 -7.87E-04 -8.00E-04 PASS 8.00E-04 PASS -2.69E-04 1.99E-04 2.77E-04 -8.16E-04 -9.50E-04 PASS 9.50E-04 PASS -2.69E-04 1.98E-04 2.74E-04 -8.11E-04 -9.50E-04 PASS 9.50E-04 PASS -2.69E-04 1.99E-04 2.77E-04 -8.15E-04 -9.50E-04 PASS 9.50E-04 PASS -2.71E-04 1.99E-04 2.75E-04 -8.17E-04 -9.50E-04 PASS 9.50E-04 PASS -2.69E-04 1.99E-04 2.78E-04 -8.15E-04 -9.50E-04 PASS 9.50E-04 PASS -2.69E-04 1.99E-04 2.78E-04 -8.15E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 20 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.7. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 21 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.7. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.32E-09 4.45E-09 -1.23E-09 3.69E-09 -3.30E-10 -3.32E-09 1.01E-09 -1.24E-09 -3.74E-09 -2.03E-09 -1.24E-09 10 1.28E-09 4.09E-09 -1.77E-09 3.51E-09 -6.55E-10 -3.37E-09 6.78E-10 -1.70E-09 -3.19E-09 -2.29E-09 -1.17E-09 20 1.18E-09 4.09E-09 -1.83E-09 3.28E-09 -6.03E-10 -3.48E-09 6.60E-10 -1.96E-09 -3.44E-09 -2.29E-09 -1.21E-09 30 1.20E-09 3.45E-09 -1.59E-09 3.13E-09 -6.60E-10 -3.34E-09 1.38E-10 -1.29E-09 -3.31E-09 -2.52E-09 -1.23E-09 50 1.69E-09 3.25E-09 -2.04E-09 3.00E-09 -6.31E-10 -3.81E-09 6.09E-10 -1.26E-09 -3.26E-09 -2.75E-09 -1.20E-09 60 1.63E-09 3.06E-09 -2.02E-09 3.03E-09 -6.38E-10 -3.69E-09 4.96E-10 -1.24E-09 -3.24E-09 -2.56E-09 -1.24E-09 70 1.63E-09 3.06E-09 -2.02E-09 3.03E-09 -6.38E-10 -3.69E-09 4.96E-10 -1.24E-09 -3.24E-09 -2.56E-09 -1.24E-09 1.58E-09 2.47E-09 8.34E-09 -5.18E-09 1.29E-09 2.55E-09 8.28E-09 -5.69E-09 1.22E-09 2.51E-09 8.09E-09 -5.65E-09 1.11E-09 2.23E-09 7.23E-09 -5.02E-09 1.05E-09 2.31E-09 7.40E-09 -5.29E-09 1.01E-09 2.27E-09 7.23E-09 -5.21E-09 1.01E-09 2.27E-09 7.23E-09 -5.21E-09 -1.87E-09 1.89E-09 3.31E-09 -7.04E-09 -7.00E-08 PASS 7.00E-08 PASS -1.98E-09 1.63E-09 2.49E-09 -6.44E-09 -1.00E-07 PASS 1.00E-07 PASS -2.10E-09 1.69E-09 2.52E-09 -6.73E-09 -1.00E-07 PASS 1.00E-07 PASS -2.06E-09 1.49E-09 2.02E-09 -6.14E-09 -1.00E-07 PASS 1.00E-07 PASS -2.09E-09 1.79E-09 2.80E-09 -6.99E-09 -1.00E-07 PASS 1.00E-07 PASS -2.05E-09 1.70E-09 2.60E-09 -6.70E-09 -1.00E-07 PASS 1.00E-07 PASS -2.05E-09 1.70E-09 2.60E-09 -6.70E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 22 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.8. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 23 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.8. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -7.71E-09 -2.96E-10 1.03E-09 3.41E-09 4.34E-10 -7.14E-10 1.54E-09 2.47E-09 -2.56E-09 -3.00E-12 -5.16E-09 10 -9.05E-09 -3.97E-10 5.60E-10 3.37E-09 -1.52E-10 -7.79E-10 1.36E-09 2.41E-09 -2.46E-09 3.60E-11 -5.23E-09 20 -8.71E-09 -2.98E-10 5.06E-10 3.07E-09 6.00E-12 -8.60E-11 1.40E-09 2.32E-09 -2.83E-09 -1.02E-10 -5.17E-09 30 -8.45E-09 -2.68E-10 4.64E-10 3.17E-09 5.07E-10 -4.03E-10 1.30E-09 2.69E-09 -2.42E-09 -6.10E-11 -5.24E-09 50 -9.10E-09 -5.55E-10 9.90E-11 2.75E-09 3.36E-10 -7.80E-10 5.26E-10 2.34E-09 -2.40E-09 4.80E-11 -5.17E-09 60 -8.23E-09 -4.51E-10 -4.50E-11 2.76E-09 4.83E-10 -6.59E-10 9.58E-10 2.59E-09 -2.46E-09 1.79E-10 -5.26E-09 70 -8.23E-09 -4.51E-10 -4.50E-11 2.76E-09 4.83E-10 -6.59E-10 9.58E-10 2.59E-09 -2.46E-09 1.79E-10 -5.26E-09 -6.27E-10 4.19E-09 1.09E-08 -1.21E-08 -1.13E-09 4.67E-09 1.17E-08 -1.40E-08 -1.08E-09 4.47E-09 1.12E-08 -1.33E-08 -9.16E-10 4.41E-09 1.12E-08 -1.30E-08 -1.29E-09 4.54E-09 1.11E-08 -1.37E-08 -1.10E-09 4.17E-09 1.04E-08 -1.25E-08 -1.10E-09 4.17E-09 1.04E-08 -1.25E-08 1.47E-10 1.96E-09 5.53E-09 -5.24E-09 -7.00E-08 PASS 7.00E-08 PASS 1.12E-10 1.88E-09 5.28E-09 -5.05E-09 -1.00E-07 PASS 1.00E-07 PASS 1.41E-10 1.96E-09 5.50E-09 -5.22E-09 -1.00E-07 PASS 1.00E-07 PASS 2.19E-10 1.92E-09 5.47E-09 -5.04E-09 -1.00E-07 PASS 1.00E-07 PASS -5.36E-11 1.74E-09 4.72E-09 -4.82E-09 -1.00E-07 PASS 1.00E-07 PASS 1.21E-10 1.87E-09 5.26E-09 -5.02E-09 -1.00E-07 PASS 1.00E-07 PASS 1.21E-10 1.87E-09 5.26E-09 -5.02E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 24 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.9. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 25 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.9. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.78E-09 -1.54E-09 5.21E-09 -1.63E-09 -3.24E-09 -4.79E-09 -2.35E-09 1.98E-09 2.97E-10 2.57E-09 2.86E-09 10 -2.17E-09 -1.70E-09 5.24E-09 -2.53E-09 -3.10E-09 -5.28E-09 -2.32E-09 1.91E-09 -7.10E-11 2.01E-09 2.85E-09 20 -2.48E-09 -1.66E-09 5.25E-09 -2.54E-09 -2.80E-09 -5.10E-09 -2.25E-09 1.99E-09 3.61E-10 2.45E-09 2.88E-09 30 -2.37E-09 -1.34E-09 5.31E-09 -2.69E-09 -2.76E-09 -4.82E-09 -2.05E-09 2.39E-09 4.73E-10 2.47E-09 2.85E-09 50 -2.33E-09 -1.84E-09 5.12E-09 -2.91E-09 -2.81E-09 -4.71E-09 -2.37E-09 2.55E-09 1.22E-09 2.42E-09 2.86E-09 60 -2.24E-09 -1.74E-09 5.14E-09 -2.75E-09 -2.76E-09 -4.35E-09 -1.95E-09 2.35E-09 9.39E-10 2.28E-09 2.90E-09 70 -2.24E-09 -1.74E-09 5.14E-09 -2.75E-09 -2.76E-09 -4.35E-09 -1.95E-09 2.35E-09 9.39E-10 2.28E-09 2.90E-09 -5.98E-10 3.32E-09 8.50E-09 -9.69E-09 -8.49E-10 3.44E-09 8.60E-09 -1.03E-08 -8.46E-10 3.44E-09 8.58E-09 -1.03E-08 -7.68E-10 3.45E-09 8.68E-09 -1.02E-08 -9.53E-10 3.42E-09 8.42E-09 -1.03E-08 -8.70E-10 3.38E-09 8.41E-09 -1.01E-08 -8.70E-10 3.38E-09 8.41E-09 -1.01E-08 -4.60E-10 3.09E-09 8.00E-09 -8.92E-09 -7.00E-08 PASS 7.00E-08 PASS -7.51E-10 3.09E-09 7.71E-09 -9.22E-09 -1.00E-07 PASS 1.00E-07 PASS -5.09E-10 3.15E-09 8.14E-09 -9.16E-09 -1.00E-07 PASS 1.00E-07 PASS -3.09E-10 3.12E-09 8.24E-09 -8.86E-09 -1.00E-07 PASS 1.00E-07 PASS -1.78E-10 3.22E-09 8.65E-09 -9.01E-09 -1.00E-07 PASS 1.00E-07 PASS -1.46E-10 2.92E-09 7.87E-09 -8.16E-09 -1.00E-07 PASS 1.00E-07 PASS -1.46E-10 2.92E-09 7.87E-09 -8.16E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 26 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.10. Plot of Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 27 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.10. Raw data for Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.85E-09 2.14E-09 -4.74E-09 -2.52E-09 -1.30E-09 -2.14E-09 9.00E-10 -1.18E-08 -3.67E-09 -4.89E-09 -1.45E-09 10 -2.27E-09 2.61E-09 -4.68E-09 -2.24E-09 -1.27E-09 -2.79E-09 8.85E-10 -1.24E-08 -3.71E-09 -4.61E-09 -1.36E-09 20 -2.31E-09 2.47E-09 -4.88E-09 -2.24E-09 -1.65E-09 -2.56E-09 5.06E-10 -1.25E-08 -3.62E-09 -4.68E-09 -1.46E-09 30 -2.17E-09 2.71E-09 -4.85E-09 -2.21E-09 -1.41E-09 -2.19E-09 9.51E-10 -1.24E-08 -3.08E-09 -5.01E-09 -1.35E-09 50 -2.25E-09 2.78E-09 -4.50E-09 -1.66E-09 -1.90E-09 -2.23E-09 1.52E-09 -1.20E-08 -3.23E-09 -4.86E-09 -1.47E-09 60 -2.34E-09 2.49E-09 -4.57E-09 -1.49E-09 -1.82E-09 -2.37E-09 1.12E-09 -1.16E-08 -3.29E-09 -4.60E-09 -1.48E-09 70 -2.34E-09 2.49E-09 -4.57E-09 -1.49E-09 -1.82E-09 -2.37E-09 1.12E-09 -1.16E-08 -3.29E-09 -4.60E-09 -1.48E-09 -1.65E-09 2.49E-09 5.18E-09 -8.49E-09 -1.57E-09 2.65E-09 5.71E-09 -8.85E-09 -1.72E-09 2.65E-09 5.55E-09 -8.99E-09 -1.58E-09 2.73E-09 5.90E-09 -9.07E-09 -1.51E-09 2.65E-09 5.76E-09 -8.77E-09 -1.54E-09 2.56E-09 5.46E-09 -8.55E-09 -1.54E-09 2.56E-09 5.46E-09 -8.55E-09 -4.33E-09 4.73E-09 8.63E-09 -1.73E-08 -7.00E-08 PASS 7.00E-08 PASS -4.52E-09 4.86E-09 8.81E-09 -1.78E-08 -1.00E-07 PASS 1.00E-07 PASS -4.57E-09 4.83E-09 8.69E-09 -1.78E-08 -1.00E-07 PASS 1.00E-07 PASS -4.35E-09 4.99E-09 9.35E-09 -1.80E-08 -1.00E-07 PASS 1.00E-07 PASS -4.15E-09 4.96E-09 9.44E-09 -1.77E-08 -1.00E-07 PASS 1.00E-07 PASS -4.15E-09 4.68E-09 8.68E-09 -1.70E-08 -1.00E-07 PASS 1.00E-07 PASS -4.15E-09 4.68E-09 8.68E-09 -1.70E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 28 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.11. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 29 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.11. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.55E-07 -2.35E-07 -2.32E-07 -2.46E-07 -2.60E-07 -2.63E-07 -2.57E-07 -2.47E-07 -2.37E-07 -2.39E-07 -2.49E-07 10 -2.70E-07 -2.38E-07 -2.35E-07 -2.52E-07 -2.64E-07 -2.75E-07 -2.71E-07 -2.59E-07 -2.50E-07 -2.52E-07 -2.51E-07 20 -2.72E-07 -2.41E-07 -2.38E-07 -2.54E-07 -2.66E-07 -2.80E-07 -2.77E-07 -2.65E-07 -2.55E-07 -2.56E-07 -2.51E-07 30 -2.72E-07 -2.42E-07 -2.39E-07 -2.54E-07 -2.67E-07 -2.84E-07 -2.82E-07 -2.69E-07 -2.59E-07 -2.61E-07 -2.50E-07 50 -2.75E-07 -2.47E-07 -2.42E-07 -2.57E-07 -2.70E-07 -2.91E-07 -2.89E-07 -2.76E-07 -2.65E-07 -2.68E-07 -2.50E-07 60 -2.70E-07 -2.42E-07 -2.39E-07 -2.53E-07 -2.65E-07 -2.89E-07 -2.87E-07 -2.73E-07 -2.63E-07 -2.65E-07 -2.51E-07 70 -2.70E-07 -2.42E-07 -2.39E-07 -2.53E-07 -2.65E-07 -2.89E-07 -2.87E-07 -2.73E-07 -2.63E-07 -2.65E-07 -2.51E-07 -2.46E-07 1.22E-08 -2.12E-07 -2.79E-07 -2.52E-07 1.51E-08 -2.10E-07 -2.93E-07 -2.54E-07 1.48E-08 -2.14E-07 -2.95E-07 -2.55E-07 1.45E-08 -2.15E-07 -2.95E-07 -2.58E-07 1.42E-08 -2.19E-07 -2.97E-07 -2.54E-07 1.37E-08 -2.16E-07 -2.91E-07 -2.54E-07 1.37E-08 -2.16E-07 -2.91E-07 -2.49E-07 1.13E-08 -2.18E-07 -2.80E-07 -7.15E-07 PASS 7.15E-07 PASS -2.61E-07 1.15E-08 -2.30E-07 -2.93E-07 -7.65E-07 PASS 7.65E-07 PASS -2.67E-07 1.16E-08 -2.35E-07 -2.98E-07 -8.15E-07 PASS 8.15E-07 PASS -2.71E-07 1.14E-08 -2.39E-07 -3.02E-07 -8.15E-07 PASS 8.15E-07 PASS -2.78E-07 1.17E-08 -2.46E-07 -3.10E-07 -8.65E-07 PASS 8.65E-07 PASS -2.76E-07 1.18E-08 -2.43E-07 -3.08E-07 -8.65E-07 PASS 8.65E-07 PASS -2.76E-07 1.18E-08 -2.43E-07 -3.08E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 30 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.12. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 31 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.12. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.42E-07 -2.43E-07 -2.39E-07 -2.25E-07 -2.40E-07 -2.32E-07 -2.58E-07 -2.63E-07 -2.40E-07 -2.43E-07 -2.35E-07 10 -2.57E-07 -2.45E-07 -2.42E-07 -2.29E-07 -2.43E-07 -2.43E-07 -2.70E-07 -2.77E-07 -2.53E-07 -2.56E-07 -2.38E-07 20 -2.59E-07 -2.47E-07 -2.45E-07 -2.30E-07 -2.45E-07 -2.48E-07 -2.74E-07 -2.82E-07 -2.58E-07 -2.61E-07 -2.38E-07 30 -2.59E-07 -2.48E-07 -2.45E-07 -2.31E-07 -2.45E-07 -2.52E-07 -2.77E-07 -2.86E-07 -2.62E-07 -2.65E-07 -2.37E-07 50 -2.63E-07 -2.52E-07 -2.49E-07 -2.33E-07 -2.48E-07 -2.59E-07 -2.83E-07 -2.94E-07 -2.68E-07 -2.72E-07 -2.37E-07 60 -2.57E-07 -2.48E-07 -2.45E-07 -2.30E-07 -2.45E-07 -2.57E-07 -2.81E-07 -2.91E-07 -2.66E-07 -2.70E-07 -2.38E-07 70 -2.57E-07 -2.48E-07 -2.45E-07 -2.30E-07 -2.45E-07 -2.57E-07 -2.81E-07 -2.91E-07 -2.66E-07 -2.70E-07 -2.38E-07 -2.38E-07 7.41E-09 -2.17E-07 -2.58E-07 -2.43E-07 1.02E-08 -2.16E-07 -2.71E-07 -2.45E-07 1.04E-08 -2.17E-07 -2.74E-07 -2.46E-07 1.00E-08 -2.18E-07 -2.73E-07 -2.49E-07 1.05E-08 -2.20E-07 -2.78E-07 -2.45E-07 9.68E-09 -2.18E-07 -2.71E-07 -2.45E-07 9.68E-09 -2.18E-07 -2.71E-07 -2.47E-07 1.31E-08 -2.11E-07 -2.83E-07 -7.15E-07 PASS 7.15E-07 PASS -2.60E-07 1.33E-08 -2.23E-07 -2.96E-07 -7.65E-07 PASS 7.65E-07 PASS -2.65E-07 1.36E-08 -2.27E-07 -3.02E-07 -8.15E-07 PASS 8.15E-07 PASS -2.68E-07 1.36E-08 -2.31E-07 -3.06E-07 -8.15E-07 PASS 8.15E-07 PASS -2.75E-07 1.35E-08 -2.38E-07 -3.12E-07 -8.65E-07 PASS 8.65E-07 PASS -2.73E-07 1.34E-08 -2.36E-07 -3.10E-07 -8.65E-07 PASS 8.65E-07 PASS -2.73E-07 1.34E-08 -2.36E-07 -3.10E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 32 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.13. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 33 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.13. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.31E-07 -2.43E-07 -2.40E-07 -2.29E-07 -2.39E-07 -2.35E-07 -2.59E-07 -2.65E-07 -2.38E-07 -2.43E-07 -2.33E-07 10 -2.45E-07 -2.46E-07 -2.44E-07 -2.33E-07 -2.42E-07 -2.46E-07 -2.71E-07 -2.78E-07 -2.51E-07 -2.56E-07 -2.35E-07 20 -2.47E-07 -2.48E-07 -2.46E-07 -2.35E-07 -2.44E-07 -2.51E-07 -2.76E-07 -2.83E-07 -2.57E-07 -2.61E-07 -2.35E-07 30 -2.47E-07 -2.49E-07 -2.47E-07 -2.36E-07 -2.45E-07 -2.55E-07 -2.79E-07 -2.88E-07 -2.61E-07 -2.65E-07 -2.34E-07 50 -2.51E-07 -2.53E-07 -2.50E-07 -2.38E-07 -2.47E-07 -2.62E-07 -2.85E-07 -2.95E-07 -2.67E-07 -2.73E-07 -2.34E-07 60 -2.45E-07 -2.49E-07 -2.47E-07 -2.34E-07 -2.43E-07 -2.59E-07 -2.83E-07 -2.92E-07 -2.65E-07 -2.71E-07 -2.35E-07 70 -2.45E-07 -2.49E-07 -2.47E-07 -2.34E-07 -2.43E-07 -2.59E-07 -2.83E-07 -2.92E-07 -2.65E-07 -2.71E-07 -2.35E-07 -2.36E-07 6.03E-09 -2.20E-07 -2.53E-07 -2.42E-07 4.99E-09 -2.28E-07 -2.56E-07 -2.44E-07 5.26E-09 -2.30E-07 -2.59E-07 -2.45E-07 5.21E-09 -2.30E-07 -2.59E-07 -2.48E-07 6.11E-09 -2.31E-07 -2.65E-07 -2.44E-07 5.86E-09 -2.28E-07 -2.60E-07 -2.44E-07 5.86E-09 -2.28E-07 -2.60E-07 -2.48E-07 1.33E-08 -2.11E-07 -2.85E-07 -7.15E-07 PASS 7.15E-07 PASS -2.60E-07 1.34E-08 -2.24E-07 -2.97E-07 -7.65E-07 PASS 7.65E-07 PASS -2.66E-07 1.35E-08 -2.28E-07 -3.03E-07 -8.15E-07 PASS 8.15E-07 PASS -2.69E-07 1.36E-08 -2.32E-07 -3.07E-07 -8.15E-07 PASS 8.15E-07 PASS -2.76E-07 1.36E-08 -2.39E-07 -3.14E-07 -8.65E-07 PASS 8.65E-07 PASS -2.74E-07 1.34E-08 -2.37E-07 -3.11E-07 -8.65E-07 PASS 8.65E-07 PASS -2.74E-07 1.34E-08 -2.37E-07 -3.11E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 34 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.14. Plot of Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 35 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.14. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.63E-07 -2.31E-07 -2.33E-07 -2.45E-07 -2.59E-07 -2.59E-07 -2.62E-07 -2.54E-07 -2.33E-07 -2.39E-07 -2.47E-07 10 -2.78E-07 -2.34E-07 -2.37E-07 -2.49E-07 -2.62E-07 -2.71E-07 -2.75E-07 -2.66E-07 -2.45E-07 -2.51E-07 -2.49E-07 20 -2.80E-07 -2.37E-07 -2.39E-07 -2.51E-07 -2.64E-07 -2.75E-07 -2.81E-07 -2.71E-07 -2.50E-07 -2.56E-07 -2.49E-07 30 -2.80E-07 -2.38E-07 -2.40E-07 -2.52E-07 -2.64E-07 -2.79E-07 -2.84E-07 -2.76E-07 -2.54E-07 -2.60E-07 -2.48E-07 50 -2.84E-07 -2.42E-07 -2.43E-07 -2.55E-07 -2.68E-07 -2.86E-07 -2.92E-07 -2.83E-07 -2.61E-07 -2.67E-07 -2.48E-07 60 -2.78E-07 -2.38E-07 -2.40E-07 -2.50E-07 -2.63E-07 -2.84E-07 -2.90E-07 -2.80E-07 -2.59E-07 -2.65E-07 -2.49E-07 70 -2.78E-07 -2.38E-07 -2.40E-07 -2.50E-07 -2.63E-07 -2.84E-07 -2.90E-07 -2.80E-07 -2.59E-07 -2.65E-07 -2.49E-07 -2.46E-07 1.43E-08 -2.07E-07 -2.85E-07 -2.52E-07 1.81E-08 -2.02E-07 -3.01E-07 -2.54E-07 1.80E-08 -2.05E-07 -3.04E-07 -2.55E-07 1.77E-08 -2.06E-07 -3.03E-07 -2.58E-07 1.76E-08 -2.10E-07 -3.07E-07 -2.54E-07 1.70E-08 -2.07E-07 -3.00E-07 -2.54E-07 1.70E-08 -2.07E-07 -3.00E-07 -2.49E-07 1.27E-08 -2.14E-07 -2.84E-07 -7.15E-07 PASS 7.15E-07 PASS -2.62E-07 1.29E-08 -2.26E-07 -2.97E-07 -7.65E-07 PASS 7.65E-07 PASS -2.67E-07 1.30E-08 -2.31E-07 -3.02E-07 -8.15E-07 PASS 8.15E-07 PASS -2.71E-07 1.28E-08 -2.35E-07 -3.06E-07 -8.15E-07 PASS 8.15E-07 PASS -2.78E-07 1.31E-08 -2.42E-07 -3.14E-07 -8.65E-07 PASS 8.65E-07 PASS -2.75E-07 1.31E-08 -2.39E-07 -3.11E-07 -8.65E-07 PASS 8.65E-07 PASS -2.75E-07 1.31E-08 -2.39E-07 -3.11E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 36 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.15. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 37 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.15. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.56E-07 -2.39E-07 -2.30E-07 -2.50E-07 -2.59E-07 -2.59E-07 -2.57E-07 -2.45E-07 -2.33E-07 -2.37E-07 -2.47E-07 10 -2.70E-07 -2.42E-07 -2.33E-07 -2.55E-07 -2.62E-07 -2.71E-07 -2.71E-07 -2.57E-07 -2.46E-07 -2.49E-07 -2.49E-07 20 -2.73E-07 -2.45E-07 -2.36E-07 -2.56E-07 -2.65E-07 -2.76E-07 -2.77E-07 -2.62E-07 -2.51E-07 -2.53E-07 -2.49E-07 30 -2.72E-07 -2.45E-07 -2.37E-07 -2.57E-07 -2.65E-07 -2.79E-07 -2.81E-07 -2.66E-07 -2.55E-07 -2.58E-07 -2.48E-07 50 -2.77E-07 -2.50E-07 -2.40E-07 -2.60E-07 -2.68E-07 -2.86E-07 -2.89E-07 -2.74E-07 -2.62E-07 -2.64E-07 -2.48E-07 60 -2.71E-07 -2.45E-07 -2.37E-07 -2.55E-07 -2.64E-07 -2.84E-07 -2.87E-07 -2.71E-07 -2.59E-07 -2.62E-07 -2.49E-07 70 -2.71E-07 -2.45E-07 -2.37E-07 -2.55E-07 -2.64E-07 -2.84E-07 -2.87E-07 -2.71E-07 -2.59E-07 -2.62E-07 -2.49E-07 -2.47E-07 1.22E-08 -2.13E-07 -2.80E-07 -2.52E-07 1.51E-08 -2.11E-07 -2.94E-07 -2.55E-07 1.47E-08 -2.14E-07 -2.95E-07 -2.55E-07 1.46E-08 -2.15E-07 -2.95E-07 -2.59E-07 1.46E-08 -2.19E-07 -2.99E-07 -2.54E-07 1.40E-08 -2.16E-07 -2.93E-07 -2.54E-07 1.40E-08 -2.16E-07 -2.93E-07 -2.46E-07 1.19E-08 -2.13E-07 -2.79E-07 -7.15E-07 PASS 7.15E-07 PASS -2.59E-07 1.21E-08 -2.26E-07 -2.92E-07 -7.65E-07 PASS 7.65E-07 PASS -2.64E-07 1.22E-08 -2.30E-07 -2.97E-07 -8.15E-07 PASS 8.15E-07 PASS -2.68E-07 1.22E-08 -2.35E-07 -3.01E-07 -8.15E-07 PASS 8.15E-07 PASS -2.75E-07 1.25E-08 -2.41E-07 -3.09E-07 -8.65E-07 PASS 8.65E-07 PASS -2.73E-07 1.24E-08 -2.38E-07 -3.07E-07 -8.65E-07 PASS 8.65E-07 PASS -2.73E-07 1.24E-08 -2.38E-07 -3.07E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 38 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.16. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 39 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.16. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.34E-07 -2.41E-07 -2.39E-07 -2.28E-07 -2.39E-07 -2.30E-07 -2.59E-07 -2.65E-07 -2.37E-07 -2.42E-07 -2.30E-07 10 -2.48E-07 -2.44E-07 -2.42E-07 -2.32E-07 -2.43E-07 -2.42E-07 -2.70E-07 -2.78E-07 -2.49E-07 -2.55E-07 -2.32E-07 20 -2.50E-07 -2.47E-07 -2.45E-07 -2.33E-07 -2.45E-07 -2.47E-07 -2.75E-07 -2.83E-07 -2.54E-07 -2.61E-07 -2.32E-07 30 -2.50E-07 -2.47E-07 -2.45E-07 -2.34E-07 -2.46E-07 -2.51E-07 -2.78E-07 -2.88E-07 -2.58E-07 -2.65E-07 -2.31E-07 50 -2.53E-07 -2.51E-07 -2.48E-07 -2.36E-07 -2.48E-07 -2.58E-07 -2.83E-07 -2.95E-07 -2.65E-07 -2.72E-07 -2.31E-07 60 -2.48E-07 -2.47E-07 -2.45E-07 -2.32E-07 -2.44E-07 -2.55E-07 -2.81E-07 -2.93E-07 -2.63E-07 -2.69E-07 -2.32E-07 70 -2.48E-07 -2.47E-07 -2.45E-07 -2.32E-07 -2.44E-07 -2.55E-07 -2.81E-07 -2.93E-07 -2.63E-07 -2.69E-07 -2.32E-07 -2.36E-07 5.48E-09 -2.21E-07 -2.51E-07 -2.42E-07 5.94E-09 -2.26E-07 -2.58E-07 -2.44E-07 6.46E-09 -2.26E-07 -2.62E-07 -2.44E-07 6.22E-09 -2.27E-07 -2.61E-07 -2.47E-07 6.76E-09 -2.29E-07 -2.66E-07 -2.43E-07 6.30E-09 -2.26E-07 -2.60E-07 -2.43E-07 6.30E-09 -2.26E-07 -2.60E-07 -2.47E-07 1.48E-08 -2.06E-07 -2.87E-07 -7.15E-07 PASS 7.15E-07 PASS -2.59E-07 1.48E-08 -2.18E-07 -3.00E-07 -7.65E-07 PASS 7.65E-07 PASS -2.64E-07 1.49E-08 -2.23E-07 -3.05E-07 -8.15E-07 PASS 8.15E-07 PASS -2.68E-07 1.49E-08 -2.27E-07 -3.09E-07 -8.15E-07 PASS 8.15E-07 PASS -2.75E-07 1.48E-08 -2.34E-07 -3.15E-07 -8.65E-07 PASS 8.65E-07 PASS -2.72E-07 1.49E-08 -2.32E-07 -3.13E-07 -8.65E-07 PASS 8.65E-07 PASS -2.72E-07 1.49E-08 -2.32E-07 -3.13E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 40 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.17. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 41 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.17. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.29E-07 -2.41E-07 -2.45E-07 -2.27E-07 -2.35E-07 -2.29E-07 -2.56E-07 -2.66E-07 -2.38E-07 -2.45E-07 -2.35E-07 10 -2.42E-07 -2.44E-07 -2.48E-07 -2.31E-07 -2.39E-07 -2.41E-07 -2.68E-07 -2.79E-07 -2.51E-07 -2.57E-07 -2.37E-07 20 -2.44E-07 -2.47E-07 -2.51E-07 -2.32E-07 -2.41E-07 -2.45E-07 -2.72E-07 -2.84E-07 -2.56E-07 -2.63E-07 -2.37E-07 30 -2.44E-07 -2.47E-07 -2.51E-07 -2.33E-07 -2.42E-07 -2.49E-07 -2.76E-07 -2.89E-07 -2.60E-07 -2.67E-07 -2.37E-07 50 -2.48E-07 -2.51E-07 -2.55E-07 -2.35E-07 -2.44E-07 -2.56E-07 -2.82E-07 -2.97E-07 -2.68E-07 -2.75E-07 -2.36E-07 60 -2.43E-07 -2.47E-07 -2.51E-07 -2.31E-07 -2.40E-07 -2.54E-07 -2.80E-07 -2.94E-07 -2.65E-07 -2.72E-07 -2.37E-07 70 -2.43E-07 -2.47E-07 -2.51E-07 -2.31E-07 -2.40E-07 -2.54E-07 -2.80E-07 -2.94E-07 -2.65E-07 -2.72E-07 -2.37E-07 -2.35E-07 7.69E-09 -2.14E-07 -2.56E-07 -2.41E-07 6.53E-09 -2.23E-07 -2.59E-07 -2.43E-07 7.07E-09 -2.24E-07 -2.62E-07 -2.43E-07 6.98E-09 -2.24E-07 -2.63E-07 -2.47E-07 7.82E-09 -2.25E-07 -2.68E-07 -2.42E-07 7.72E-09 -2.21E-07 -2.64E-07 -2.42E-07 7.72E-09 -2.21E-07 -2.64E-07 -2.47E-07 1.45E-08 -2.07E-07 -2.86E-07 -7.15E-07 PASS 7.15E-07 PASS -2.59E-07 1.49E-08 -2.18E-07 -3.00E-07 -7.65E-07 PASS 7.65E-07 PASS -2.64E-07 1.49E-08 -2.23E-07 -3.05E-07 -8.15E-07 PASS 8.15E-07 PASS -2.68E-07 1.52E-08 -2.27E-07 -3.10E-07 -8.15E-07 PASS 8.15E-07 PASS -2.75E-07 1.51E-08 -2.34E-07 -3.17E-07 -8.65E-07 PASS 8.65E-07 PASS -2.73E-07 1.49E-08 -2.32E-07 -3.14E-07 -8.65E-07 PASS 8.65E-07 PASS -2.73E-07 1.49E-08 -2.32E-07 -3.14E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 42 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.18. Plot of Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 43 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.18. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.61E-07 -2.33E-07 -2.28E-07 -2.42E-07 -2.57E-07 -2.56E-07 -2.62E-07 -2.42E-07 -2.29E-07 -2.34E-07 -2.45E-07 10 -2.75E-07 -2.36E-07 -2.32E-07 -2.47E-07 -2.60E-07 -2.68E-07 -2.75E-07 -2.53E-07 -2.41E-07 -2.46E-07 -2.47E-07 20 -2.77E-07 -2.39E-07 -2.34E-07 -2.48E-07 -2.62E-07 -2.72E-07 -2.80E-07 -2.59E-07 -2.46E-07 -2.51E-07 -2.47E-07 30 -2.77E-07 -2.40E-07 -2.34E-07 -2.49E-07 -2.62E-07 -2.76E-07 -2.84E-07 -2.63E-07 -2.51E-07 -2.54E-07 -2.46E-07 50 -2.81E-07 -2.44E-07 -2.39E-07 -2.52E-07 -2.65E-07 -2.83E-07 -2.92E-07 -2.70E-07 -2.57E-07 -2.61E-07 -2.46E-07 60 -2.75E-07 -2.40E-07 -2.35E-07 -2.48E-07 -2.61E-07 -2.81E-07 -2.90E-07 -2.68E-07 -2.55E-07 -2.59E-07 -2.47E-07 70 -2.75E-07 -2.40E-07 -2.35E-07 -2.48E-07 -2.61E-07 -2.81E-07 -2.90E-07 -2.68E-07 -2.55E-07 -2.59E-07 -2.47E-07 -2.44E-07 1.45E-08 -2.04E-07 -2.84E-07 -2.50E-07 1.77E-08 -2.01E-07 -2.98E-07 -2.52E-07 1.78E-08 -2.03E-07 -3.01E-07 -2.52E-07 1.74E-08 -2.05E-07 -3.00E-07 -2.56E-07 1.71E-08 -2.09E-07 -3.03E-07 -2.52E-07 1.65E-08 -2.06E-07 -2.97E-07 -2.52E-07 1.65E-08 -2.06E-07 -2.97E-07 -2.44E-07 1.42E-08 -2.05E-07 -2.83E-07 -7.15E-07 PASS 7.15E-07 PASS -2.57E-07 1.44E-08 -2.17E-07 -2.96E-07 -7.65E-07 PASS 7.65E-07 PASS -2.62E-07 1.43E-08 -2.22E-07 -3.01E-07 -8.15E-07 PASS 8.15E-07 PASS -2.66E-07 1.43E-08 -2.26E-07 -3.05E-07 -8.15E-07 PASS 8.15E-07 PASS -2.73E-07 1.47E-08 -2.32E-07 -3.13E-07 -8.65E-07 PASS 8.65E-07 PASS -2.70E-07 1.45E-08 -2.31E-07 -3.10E-07 -8.65E-07 PASS 8.65E-07 PASS -2.70E-07 1.45E-08 -2.31E-07 -3.10E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 44 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.19. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 45 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.19. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.84E-05 5.88E-05 2.70E-05 2.35E-04 -1.60E-04 1.09E-04 -9.71E-05 -6.24E-06 2.98E-04 -1.21E-04 -2.56E-04 10 4.00E-05 3.93E-05 4.99E-06 2.23E-04 -1.76E-04 1.01E-04 -1.06E-04 -1.63E-05 2.88E-04 -1.25E-04 -2.56E-04 20 5.33E-05 3.25E-05 8.01E-06 2.33E-04 -1.67E-04 1.02E-04 -1.07E-04 -1.57E-05 2.91E-04 -1.21E-04 -2.57E-04 30 5.90E-05 2.72E-05 9.33E-06 2.34E-04 -1.65E-04 1.01E-04 -1.09E-04 -1.49E-05 2.93E-04 -1.19E-04 -2.57E-04 50 5.80E-05 2.29E-05 5.47E-06 2.36E-04 -1.61E-04 1.05E-04 -1.08E-04 -1.36E-05 2.94E-04 -1.18E-04 -2.57E-04 60 6.01E-05 2.25E-05 4.26E-06 2.44E-04 -1.62E-04 1.06E-04 -1.06E-04 -1.33E-05 2.93E-04 -1.18E-04 -2.58E-04 70 6.01E-05 2.25E-05 4.26E-06 2.44E-04 -1.62E-04 1.06E-04 -1.06E-04 -1.33E-05 2.93E-04 -1.18E-04 -2.58E-04 4.38E-05 1.41E-04 4.29E-04 -3.42E-04 2.63E-05 1.42E-04 4.15E-04 -3.63E-04 3.19E-05 1.42E-04 4.22E-04 -3.58E-04 3.27E-05 1.42E-04 4.23E-04 -3.57E-04 3.22E-05 1.42E-04 4.21E-04 -3.57E-04 3.37E-05 1.45E-04 4.32E-04 -3.64E-04 3.37E-05 1.45E-04 4.32E-04 -3.64E-04 3.64E-05 1.72E-04 5.08E-04 -4.35E-04 -8.00E-04 PASS 8.00E-04 PASS 2.84E-05 1.71E-04 4.96E-04 -4.39E-04 -9.50E-04 PASS 9.50E-04 PASS 2.97E-05 1.71E-04 4.99E-04 -4.39E-04 -9.50E-04 PASS 9.50E-04 PASS 3.01E-05 1.71E-04 5.00E-04 -4.40E-04 -9.50E-04 PASS 9.50E-04 PASS 3.18E-05 1.72E-04 5.04E-04 -4.40E-04 -9.50E-04 PASS 9.50E-04 PASS 3.21E-05 1.71E-04 5.02E-04 -4.38E-04 -9.50E-04 PASS 9.50E-04 PASS 3.21E-05 1.71E-04 5.02E-04 -4.38E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 46 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.20. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 47 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.20. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.24E-04 2.02E-04 3.06E-04 1.04E-04 3.39E-04 -7.20E-06 2.33E-04 -1.30E-04 -4.55E-05 4.27E-06 -1.50E-04 10 1.94E-04 1.86E-04 2.91E-04 7.88E-05 3.13E-04 -1.63E-05 2.34E-04 -1.36E-04 -4.77E-05 -7.09E-06 -1.51E-04 20 2.09E-04 1.94E-04 2.95E-04 8.58E-05 3.11E-04 -1.31E-05 2.36E-04 -1.34E-04 -4.76E-05 -6.12E-06 -1.50E-04 30 2.12E-04 1.98E-04 2.98E-04 8.80E-05 3.16E-04 -1.54E-05 2.38E-04 -1.33E-04 -4.25E-05 -5.52E-06 -1.51E-04 50 2.12E-04 2.04E-04 3.00E-04 8.27E-05 3.09E-04 -1.94E-05 2.43E-04 -1.33E-04 -4.59E-05 -3.46E-06 -1.51E-04 60 2.21E-04 2.08E-04 3.04E-04 9.64E-05 3.21E-04 -1.50E-05 2.43E-04 -1.34E-04 -4.44E-05 -3.59E-06 -1.52E-04 70 2.21E-04 2.08E-04 3.04E-04 9.64E-05 3.21E-04 -1.50E-05 2.43E-04 -1.34E-04 -4.44E-05 -3.59E-06 -1.52E-04 2.35E-04 9.26E-05 4.89E-04 -1.88E-05 2.12E-04 9.38E-05 4.70E-04 -4.47E-05 2.19E-04 9.05E-05 4.67E-04 -2.93E-05 2.22E-04 9.12E-05 4.73E-04 -2.76E-05 2.21E-04 9.14E-05 4.72E-04 -2.93E-05 2.30E-04 8.95E-05 4.76E-04 -1.54E-05 2.30E-04 8.95E-05 4.76E-04 -1.54E-05 1.10E-05 1.35E-04 3.81E-04 -3.59E-04 -8.00E-04 PASS 8.00E-04 PASS 5.23E-06 1.38E-04 3.82E-04 -3.72E-04 -9.50E-04 PASS 9.50E-04 PASS 6.90E-06 1.38E-04 3.84E-04 -3.70E-04 -9.50E-04 PASS 9.50E-04 PASS 8.44E-06 1.38E-04 3.87E-04 -3.70E-04 -9.50E-04 PASS 9.50E-04 PASS 8.28E-06 1.40E-04 3.93E-04 -3.77E-04 -9.50E-04 PASS 9.50E-04 PASS 9.25E-06 1.40E-04 3.94E-04 -3.75E-04 -9.50E-04 PASS 9.50E-04 PASS 9.25E-06 1.40E-04 3.94E-04 -3.75E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 48 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.21. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 49 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.21. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.29E-06 -7.57E-06 2.10E-04 2.09E-04 -5.75E-06 9.56E-05 2.12E-04 -8.17E-06 -1.93E-04 2.44E-04 1.09E-04 10 -2.11E-05 -4.59E-05 1.97E-04 1.62E-04 -2.98E-05 8.33E-05 2.06E-04 -1.87E-05 -2.01E-04 2.36E-04 1.07E-04 20 -1.80E-05 -5.01E-05 2.03E-04 1.66E-04 -2.52E-05 8.51E-05 2.05E-04 -1.71E-05 -1.99E-04 2.39E-04 1.07E-04 30 -1.86E-05 -5.13E-05 2.09E-04 1.69E-04 -1.56E-05 8.64E-05 2.09E-04 -1.60E-05 -2.00E-04 2.38E-04 1.07E-04 50 -2.32E-05 -6.59E-05 2.08E-04 1.64E-04 -1.81E-05 8.73E-05 2.10E-04 -1.62E-05 -1.95E-04 2.39E-04 1.07E-04 60 -2.03E-05 -6.02E-05 2.17E-04 1.70E-04 -1.74E-05 8.72E-05 2.10E-04 -1.29E-05 -1.95E-04 2.41E-04 1.04E-04 70 -2.03E-05 -6.02E-05 2.17E-04 1.70E-04 -1.74E-05 8.72E-05 2.10E-04 -1.29E-05 -1.95E-04 2.41E-04 1.04E-04 8.25E-05 1.16E-04 4.00E-04 -2.35E-04 5.24E-05 1.17E-04 3.73E-04 -2.68E-04 5.51E-05 1.19E-04 3.82E-04 -2.72E-04 5.86E-05 1.21E-04 3.90E-04 -2.73E-04 5.31E-05 1.24E-04 3.93E-04 -2.87E-04 5.77E-05 1.26E-04 4.03E-04 -2.88E-04 5.77E-05 1.26E-04 4.03E-04 -2.88E-04 7.00E-05 1.78E-04 5.58E-04 -4.18E-04 -8.00E-04 PASS 8.00E-04 PASS 6.13E-05 1.78E-04 5.50E-04 -4.28E-04 -9.50E-04 PASS 9.50E-04 PASS 6.28E-05 1.78E-04 5.51E-04 -4.25E-04 -9.50E-04 PASS 9.50E-04 PASS 6.36E-05 1.79E-04 5.54E-04 -4.26E-04 -9.50E-04 PASS 9.50E-04 PASS 6.49E-05 1.78E-04 5.52E-04 -4.22E-04 -9.50E-04 PASS 9.50E-04 PASS 6.60E-05 1.78E-04 5.53E-04 -4.21E-04 -9.50E-04 PASS 9.50E-04 PASS 6.60E-05 1.78E-04 5.53E-04 -4.21E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 50 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.22. Plot of Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 51 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.22. Raw data for Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.63E-05 2.49E-04 -1.96E-04 2.01E-04 -1.30E-04 6.07E-05 -1.74E-04 1.09E-04 3.65E-04 -4.04E-05 4.39E-05 10 2.47E-05 2.36E-04 -2.21E-04 1.84E-04 -1.51E-04 5.28E-05 -1.80E-04 1.04E-04 3.52E-04 -4.19E-05 3.99E-05 20 3.68E-05 2.39E-04 -2.13E-04 1.92E-04 -1.41E-04 5.52E-05 -1.79E-04 1.06E-04 3.52E-04 -4.20E-05 4.06E-05 30 4.53E-05 2.41E-04 -2.11E-04 1.98E-04 -1.35E-04 5.35E-05 -1.79E-04 1.09E-04 3.55E-04 -4.29E-05 3.99E-05 50 5.56E-05 2.37E-04 -2.13E-04 2.02E-04 -1.29E-04 5.33E-05 -1.82E-04 1.12E-04 3.56E-04 -4.28E-05 3.86E-05 60 5.85E-05 2.47E-04 -2.17E-04 2.04E-04 -1.31E-04 5.60E-05 -1.80E-04 1.14E-04 3.61E-04 -4.24E-05 3.83E-05 70 5.85E-05 2.47E-04 -2.17E-04 2.04E-04 -1.31E-04 5.60E-05 -1.80E-04 1.14E-04 3.61E-04 -4.24E-05 3.83E-05 3.42E-05 1.96E-04 5.73E-04 -5.04E-04 1.45E-05 2.00E-04 5.63E-04 -5.34E-04 2.27E-05 1.99E-04 5.67E-04 -5.22E-04 2.76E-05 1.99E-04 5.73E-04 -5.18E-04 3.05E-05 1.98E-04 5.74E-04 -5.13E-04 3.24E-05 2.03E-04 5.89E-04 -5.24E-04 3.24E-05 2.03E-04 5.89E-04 -5.24E-04 6.41E-05 2.00E-04 6.13E-04 -4.84E-04 -8.00E-04 PASS 8.00E-04 PASS 5.74E-05 1.97E-04 5.98E-04 -4.83E-04 -9.50E-04 PASS 9.50E-04 PASS 5.85E-05 1.97E-04 5.99E-04 -4.82E-04 -9.50E-04 PASS 9.50E-04 PASS 5.93E-05 1.98E-04 6.03E-04 -4.84E-04 -9.50E-04 PASS 9.50E-04 PASS 5.91E-05 2.00E-04 6.06E-04 -4.88E-04 -9.50E-04 PASS 9.50E-04 PASS 6.16E-05 2.01E-04 6.13E-04 -4.90E-04 -9.50E-04 PASS 9.50E-04 PASS 6.16E-05 2.01E-04 6.13E-04 -4.90E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 52 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.23. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 53 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.23. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.07E-09 7.47E-09 5.81E-09 -4.42E-09 4.31E-09 -9.17E-09 -2.34E-08 -2.09E-09 -2.76E-09 6.75E-09 -6.11E-09 10 4.34E-09 7.43E-09 5.78E-09 -3.54E-09 8.77E-09 -9.14E-09 -2.52E-08 -1.14E-09 -3.88E-09 8.87E-09 -6.13E-09 20 4.13E-09 5.89E-09 4.57E-09 -4.40E-09 1.02E-08 -9.38E-09 -2.59E-08 -1.32E-09 -3.16E-09 9.82E-09 -6.17E-09 30 4.16E-09 4.95E-09 4.36E-09 -5.10E-09 7.42E-09 -9.29E-09 -2.58E-08 -1.78E-09 -4.46E-09 9.58E-09 -6.16E-09 50 4.89E-09 4.86E-09 4.65E-09 -5.33E-09 7.07E-09 -9.45E-09 -2.70E-08 -3.00E-09 -3.65E-09 8.02E-09 -6.00E-09 60 4.39E-09 4.21E-09 4.26E-09 -4.68E-09 6.85E-09 -7.38E-09 -2.53E-08 -2.11E-09 -3.06E-09 8.90E-09 -6.10E-09 70 4.39E-09 4.21E-09 4.26E-09 -4.68E-09 6.85E-09 -7.38E-09 -2.53E-08 -2.11E-09 -3.06E-09 8.90E-09 -6.10E-09 3.45E-09 4.60E-09 1.61E-08 -9.17E-09 4.55E-09 4.82E-09 1.78E-08 -8.67E-09 4.07E-09 5.30E-09 1.86E-08 -1.05E-08 3.16E-09 4.80E-09 1.63E-08 -1.00E-08 3.23E-09 4.88E-09 1.66E-08 -1.02E-08 3.00E-09 4.44E-09 1.52E-08 -9.17E-09 3.00E-09 4.44E-09 1.52E-08 -9.17E-09 -6.12E-09 1.12E-08 2.45E-08 -3.68E-08 -7.00E-08 PASS 7.00E-08 PASS -6.09E-09 1.25E-08 2.82E-08 -4.04E-08 -1.00E-07 PASS 1.00E-07 PASS -5.99E-09 1.31E-08 3.00E-08 -4.20E-08 -1.00E-07 PASS 1.00E-07 PASS -6.36E-09 1.29E-08 2.91E-08 -4.18E-08 -1.00E-07 PASS 1.00E-07 PASS -7.01E-09 1.28E-08 2.81E-08 -4.22E-08 -1.00E-07 PASS 1.00E-07 PASS -5.78E-09 1.24E-08 2.83E-08 -3.99E-08 -1.00E-07 PASS 1.00E-07 PASS -5.78E-09 1.24E-08 2.83E-08 -3.99E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 54 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.24. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 55 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.24. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.08E-08 -1.98E-08 -1.56E-09 2.80E-09 4.47E-09 1.85E-09 1.25E-08 -4.43E-09 8.91E-10 -5.65E-09 -3.79E-10 10 1.21E-08 -1.69E-08 -3.73E-10 3.02E-09 5.30E-09 5.70E-09 1.32E-08 -3.27E-09 -1.62E-09 -6.08E-09 -5.01E-10 20 1.15E-08 -1.82E-08 -9.33E-10 2.42E-09 4.19E-09 4.75E-09 1.33E-08 -3.74E-09 -3.23E-09 -6.53E-09 -5.45E-10 30 1.09E-08 -1.85E-08 -1.70E-11 1.59E-09 3.22E-09 4.50E-09 1.36E-08 -3.52E-09 -5.07E-10 -5.08E-09 -4.29E-10 50 1.19E-08 -1.14E-08 1.95E-10 1.36E-09 4.26E-09 4.33E-09 1.44E-08 -4.04E-09 -3.04E-09 -3.75E-09 -4.27E-10 60 1.38E-08 -1.11E-08 2.12E-10 1.09E-09 3.60E-09 4.23E-09 1.40E-08 -4.48E-09 -4.83E-10 -3.30E-09 -5.47E-10 70 1.38E-08 -1.11E-08 2.12E-10 1.09E-09 3.60E-09 4.23E-09 1.40E-08 -4.48E-09 -4.83E-10 -3.30E-09 -5.47E-10 -6.56E-10 1.16E-08 3.10E-08 -3.24E-08 6.29E-10 1.08E-08 3.02E-08 -2.89E-08 -2.06E-10 1.10E-08 3.00E-08 -3.04E-08 -5.62E-10 1.09E-08 2.93E-08 -3.04E-08 1.28E-09 8.42E-09 2.44E-08 -2.18E-08 1.50E-09 8.89E-09 2.59E-08 -2.29E-08 1.50E-09 8.89E-09 2.59E-08 -2.29E-08 1.03E-09 7.18E-09 2.07E-08 -1.87E-08 -7.00E-08 PASS 7.00E-08 PASS 1.59E-09 7.83E-09 2.30E-08 -1.99E-08 -1.00E-07 PASS 1.00E-07 PASS 9.12E-10 8.10E-09 2.31E-08 -2.13E-08 -1.00E-07 PASS 1.00E-07 PASS 1.81E-09 7.55E-09 2.25E-08 -1.89E-08 -1.00E-07 PASS 1.00E-07 PASS 1.57E-09 7.94E-09 2.34E-08 -2.02E-08 -1.00E-07 PASS 1.00E-07 PASS 2.00E-09 7.52E-09 2.26E-08 -1.86E-08 -1.00E-07 PASS 1.00E-07 PASS 2.00E-09 7.52E-09 2.26E-08 -1.86E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 56 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.25. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 57 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.25. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.63E-09 -1.69E-08 -1.37E-08 9.58E-09 -3.52E-09 -7.63E-10 4.08E-09 -3.45E-09 -1.15E-09 7.11E-10 -2.37E-09 10 8.96E-09 -1.63E-08 -1.25E-08 8.40E-09 -4.26E-09 -9.12E-10 4.09E-09 -2.52E-09 -1.09E-09 8.37E-10 -2.48E-09 20 8.78E-09 -1.69E-08 -1.28E-08 7.25E-09 -4.99E-09 -5.12E-10 3.37E-09 -3.08E-09 -6.70E-11 1.21E-09 -2.39E-09 30 8.04E-09 -1.55E-08 -1.23E-08 7.52E-09 -4.08E-09 -3.73E-10 5.29E-09 -9.68E-10 -3.20E-11 8.50E-11 -2.52E-09 50 8.22E-09 -1.67E-08 -1.37E-08 7.45E-09 -4.28E-09 4.58E-10 3.28E-09 -2.26E-09 5.37E-10 -8.50E-10 -2.34E-09 60 7.40E-09 -1.59E-08 -1.26E-08 7.25E-09 -4.45E-09 1.43E-10 4.56E-09 -1.73E-09 1.71E-09 -6.09E-10 -2.50E-09 70 7.40E-09 -1.59E-08 -1.26E-08 7.25E-09 -4.45E-09 1.43E-10 4.56E-09 -1.73E-09 1.71E-09 -6.09E-10 -2.50E-09 -3.60E-09 1.18E-08 2.88E-08 -3.60E-08 -3.14E-09 1.16E-08 2.88E-08 -3.51E-08 -3.72E-09 1.16E-08 2.79E-08 -3.54E-08 -3.26E-09 1.09E-08 2.66E-08 -3.31E-08 -3.80E-09 1.16E-08 2.79E-08 -3.55E-08 -3.66E-09 1.09E-08 2.61E-08 -3.34E-08 -3.66E-09 1.09E-08 2.61E-08 -3.34E-08 -1.15E-10 2.78E-09 7.50E-09 -7.73E-09 -7.00E-08 PASS 7.00E-08 PASS 8.10E-11 2.54E-09 7.04E-09 -6.88E-09 -1.00E-07 PASS 1.00E-07 PASS 1.84E-10 2.37E-09 6.67E-09 -6.30E-09 -1.00E-07 PASS 1.00E-07 PASS 8.00E-10 2.54E-09 7.77E-09 -6.17E-09 -1.00E-07 PASS 1.00E-07 PASS 2.34E-10 2.05E-09 5.85E-09 -5.39E-09 -1.00E-07 PASS 1.00E-07 PASS 8.14E-10 2.44E-09 7.50E-09 -5.87E-09 -1.00E-07 PASS 1.00E-07 PASS 8.14E-10 2.44E-09 7.50E-09 -5.87E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 58 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.26. Plot of Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 59 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.26. Raw data for Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.18E-09 -1.80E-09 -6.02E-09 -8.54E-09 6.26E-09 -8.51E-09 -1.70E-10 1.19E-08 1.19E-09 -8.85E-09 -5.22E-09 10 1.05E-08 -8.73E-10 -5.42E-09 -9.35E-09 6.06E-09 -8.39E-09 -7.85E-10 1.18E-08 1.07E-10 -7.37E-09 -5.32E-09 20 1.02E-08 -8.04E-10 -6.02E-09 -9.53E-09 5.68E-09 -7.65E-09 -1.06E-09 1.11E-08 -1.30E-11 -7.15E-09 -5.25E-09 30 9.78E-09 -1.30E-09 -5.30E-09 -8.74E-09 5.28E-09 -8.54E-09 -7.15E-10 1.15E-08 -1.70E-11 -8.18E-09 -5.17E-09 50 1.02E-08 -1.83E-09 -5.60E-09 -9.51E-09 5.79E-09 -9.11E-09 -1.86E-09 1.03E-08 2.07E-09 -8.76E-09 -5.20E-09 60 9.44E-09 -1.35E-09 -5.03E-09 -8.49E-09 5.51E-09 -7.74E-09 -1.70E-09 1.04E-08 1.77E-09 -8.41E-09 -5.20E-09 70 9.44E-09 -1.35E-09 -5.03E-09 -8.49E-09 5.51E-09 -7.74E-09 -1.70E-09 1.04E-08 1.77E-09 -8.41E-09 -5.20E-09 -1.84E-10 7.68E-09 2.09E-08 -2.12E-08 1.81E-10 8.12E-09 2.25E-08 -2.21E-08 -9.58E-11 8.12E-09 2.22E-08 -2.24E-08 -5.60E-11 7.57E-09 2.07E-08 -2.08E-08 -1.91E-10 8.10E-09 2.20E-08 -2.24E-08 1.38E-11 7.40E-09 2.03E-08 -2.03E-08 1.38E-11 7.40E-09 2.03E-08 -2.03E-08 -8.87E-10 8.51E-09 2.25E-08 -2.42E-08 -7.00E-08 PASS 7.00E-08 PASS -9.28E-10 8.07E-09 2.12E-08 -2.30E-08 -1.00E-07 PASS 1.00E-07 PASS -9.46E-10 7.59E-09 1.99E-08 -2.18E-08 -1.00E-07 PASS 1.00E-07 PASS -1.20E-09 8.14E-09 2.11E-08 -2.35E-08 -1.00E-07 PASS 1.00E-07 PASS -1.47E-09 8.10E-09 2.07E-08 -2.37E-08 -1.00E-07 PASS 1.00E-07 PASS -1.14E-09 7.71E-09 2.00E-08 -2.23E-08 -1.00E-07 PASS 1.00E-07 PASS -1.14E-09 7.71E-09 2.00E-08 -2.23E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 60 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.27. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 61 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.27. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.43E-07 3.58E-07 3.55E-07 3.80E-07 3.96E-07 4.21E-07 3.86E-07 3.65E-07 3.86E-07 3.65E-07 4.01E-07 10 4.88E-07 3.77E-07 3.71E-07 3.96E-07 4.20E-07 4.63E-07 4.34E-07 4.09E-07 4.36E-07 4.07E-07 4.05E-07 20 5.10E-07 3.88E-07 3.82E-07 4.07E-07 4.32E-07 4.88E-07 4.60E-07 4.33E-07 4.63E-07 4.31E-07 4.06E-07 30 5.23E-07 3.96E-07 3.89E-07 4.14E-07 4.37E-07 5.05E-07 4.80E-07 4.50E-07 4.82E-07 4.49E-07 4.06E-07 50 5.51E-07 4.14E-07 4.07E-07 4.28E-07 4.52E-07 5.37E-07 5.14E-07 4.81E-07 5.16E-07 4.80E-07 4.07E-07 60 5.47E-07 4.11E-07 4.05E-07 4.25E-07 4.48E-07 5.35E-07 5.10E-07 4.77E-07 5.10E-07 4.74E-07 4.07E-07 70 5.47E-07 4.11E-07 4.05E-07 4.25E-07 4.48E-07 5.35E-07 5.10E-07 4.77E-07 5.10E-07 4.74E-07 4.07E-07 3.87E-07 3.60E-08 4.85E-07 2.88E-07 4.10E-07 4.73E-08 5.40E-07 2.81E-07 4.24E-07 5.20E-08 5.66E-07 2.81E-07 4.32E-07 5.44E-08 5.81E-07 2.82E-07 4.50E-07 5.89E-08 6.12E-07 2.89E-07 4.47E-07 5.83E-08 6.07E-07 2.87E-07 4.47E-07 5.83E-08 6.07E-07 2.87E-07 3.84E-07 2.27E-08 4.47E-07 3.22E-07 -7.15E-07 PASS 7.15E-07 PASS 4.30E-07 2.30E-08 4.93E-07 3.67E-07 -7.65E-07 PASS 7.65E-07 PASS 4.55E-07 2.37E-08 5.20E-07 3.90E-07 -8.15E-07 PASS 8.15E-07 PASS 4.73E-07 5.06E-07 5.01E-07 2.40E-08 2.47E-08 2.56E-08 5.39E-07 5.74E-07 5.71E-07 4.07E-07 4.38E-07 4.31E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 5.01E-07 2.56E-08 5.71E-07 4.31E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 62 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal Total Dose (krad(Si)) Figure 5.28. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 63 168-hr 70 Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.28. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.12E-07 4.02E-07 3.90E-07 3.84E-07 4.24E-07 3.29E-07 4.07E-07 4.34E-07 3.93E-07 3.68E-07 3.62E-07 10 4.54E-07 4.23E-07 4.10E-07 4.03E-07 4.44E-07 3.69E-07 4.46E-07 4.88E-07 4.45E-07 4.12E-07 3.65E-07 20 4.72E-07 4.37E-07 4.20E-07 4.12E-07 4.54E-07 3.90E-07 4.69E-07 5.11E-07 4.73E-07 4.39E-07 3.63E-07 30 4.86E-07 4.46E-07 4.28E-07 4.21E-07 4.62E-07 4.08E-07 4.89E-07 5.31E-07 4.91E-07 4.58E-07 3.61E-07 50 5.13E-07 4.65E-07 4.47E-07 4.36E-07 4.80E-07 4.35E-07 5.18E-07 5.66E-07 5.24E-07 4.92E-07 3.62E-07 60 5.10E-07 4.62E-07 4.45E-07 4.33E-07 4.78E-07 4.31E-07 5.14E-07 5.60E-07 5.20E-07 4.86E-07 3.63E-07 70 5.10E-07 4.62E-07 4.45E-07 4.33E-07 4.78E-07 4.31E-07 5.14E-07 5.60E-07 5.20E-07 4.86E-07 3.63E-07 4.02E-07 1.62E-08 4.47E-07 3.58E-07 4.27E-07 2.20E-08 4.87E-07 3.66E-07 4.39E-07 2.46E-08 5.07E-07 3.72E-07 4.49E-07 2.63E-08 5.21E-07 3.77E-07 4.68E-07 3.05E-08 5.52E-07 3.85E-07 4.66E-07 2.99E-08 5.48E-07 3.83E-07 4.66E-07 2.99E-08 5.48E-07 3.83E-07 3.86E-07 3.98E-08 4.96E-07 2.77E-07 -7.15E-07 PASS 7.15E-07 PASS 4.32E-07 4.44E-08 5.54E-07 3.10E-07 -7.65E-07 PASS 7.65E-07 PASS 4.56E-07 4.51E-08 5.80E-07 3.32E-07 -8.15E-07 PASS 8.15E-07 PASS 4.75E-07 5.07E-07 5.02E-07 4.58E-08 4.82E-08 4.80E-08 6.01E-07 6.39E-07 6.34E-07 3.50E-07 3.75E-07 3.71E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 5.02E-07 4.80E-08 6.34E-07 3.71E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 64 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal Total Dose (krad(Si)) Figure 5.29. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 65 168-hr 70 Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.29. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.00E-07 4.03E-07 3.90E-07 3.89E-07 4.05E-07 3.37E-07 3.92E-07 4.43E-07 3.92E-07 3.67E-07 3.55E-07 10 4.45E-07 4.26E-07 4.05E-07 4.08E-07 4.26E-07 3.72E-07 4.32E-07 4.92E-07 4.41E-07 4.13E-07 3.57E-07 20 4.63E-07 4.39E-07 4.15E-07 4.18E-07 4.40E-07 3.94E-07 4.56E-07 5.17E-07 4.69E-07 4.39E-07 3.56E-07 30 4.77E-07 4.47E-07 4.23E-07 4.26E-07 4.49E-07 4.11E-07 4.75E-07 5.39E-07 4.90E-07 4.58E-07 3.57E-07 50 5.03E-07 4.65E-07 4.40E-07 4.42E-07 4.65E-07 4.41E-07 5.07E-07 5.74E-07 5.24E-07 4.91E-07 3.59E-07 60 4.98E-07 4.63E-07 4.37E-07 4.40E-07 4.63E-07 4.37E-07 5.01E-07 5.69E-07 5.20E-07 4.86E-07 3.58E-07 70 4.98E-07 4.63E-07 4.37E-07 4.40E-07 4.63E-07 4.37E-07 5.01E-07 5.69E-07 5.20E-07 4.86E-07 3.58E-07 3.98E-07 7.48E-09 4.18E-07 3.77E-07 4.22E-07 1.62E-08 4.66E-07 3.77E-07 4.35E-07 1.94E-08 4.88E-07 3.82E-07 4.44E-07 2.19E-08 5.04E-07 3.84E-07 4.63E-07 2.54E-08 5.33E-07 3.94E-07 4.60E-07 2.45E-08 5.27E-07 3.93E-07 4.60E-07 2.45E-08 5.27E-07 3.93E-07 3.86E-07 3.90E-08 4.93E-07 2.79E-07 -7.15E-07 PASS 7.15E-07 PASS 4.30E-07 4.37E-08 5.50E-07 3.10E-07 -7.65E-07 PASS 7.65E-07 PASS 4.55E-07 4.49E-08 5.78E-07 3.32E-07 -8.15E-07 PASS 8.15E-07 PASS 4.75E-07 5.07E-07 5.03E-07 4.67E-08 4.84E-08 4.81E-08 6.03E-07 6.40E-07 6.34E-07 3.47E-07 3.75E-07 3.71E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 5.03E-07 4.81E-08 6.34E-07 3.71E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 66 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal Total Dose (krad(Si)) Figure 5.30. Plot of Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 67 168-hr 70 Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.30. Raw data for Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.46E-07 3.51E-07 3.46E-07 3.81E-07 4.05E-07 4.11E-07 3.94E-07 3.73E-07 3.86E-07 3.52E-07 4.03E-07 10 4.91E-07 3.72E-07 3.65E-07 3.99E-07 4.21E-07 4.55E-07 4.39E-07 4.17E-07 4.31E-07 3.90E-07 4.04E-07 20 5.10E-07 3.85E-07 3.75E-07 4.10E-07 4.31E-07 4.79E-07 4.66E-07 4.40E-07 4.57E-07 4.12E-07 4.04E-07 30 5.25E-07 3.94E-07 3.82E-07 4.17E-07 4.40E-07 5.00E-07 4.87E-07 4.57E-07 4.78E-07 4.31E-07 4.04E-07 50 5.53E-07 4.11E-07 3.98E-07 4.33E-07 4.55E-07 5.31E-07 5.21E-07 4.90E-07 5.10E-07 4.59E-07 4.06E-07 60 5.49E-07 4.10E-07 3.97E-07 4.29E-07 4.52E-07 5.28E-07 5.14E-07 4.84E-07 5.05E-07 4.56E-07 4.06E-07 70 5.49E-07 4.10E-07 3.97E-07 4.29E-07 4.52E-07 5.28E-07 5.14E-07 4.84E-07 5.05E-07 4.56E-07 4.06E-07 3.86E-07 4.14E-08 4.99E-07 2.73E-07 4.10E-07 5.09E-08 5.49E-07 2.70E-07 4.22E-07 5.40E-08 5.70E-07 2.74E-07 4.32E-07 5.69E-08 5.88E-07 2.76E-07 4.50E-07 6.15E-08 6.19E-07 2.81E-07 4.47E-07 6.06E-08 6.13E-07 2.81E-07 4.47E-07 6.06E-08 6.13E-07 2.81E-07 3.83E-07 2.23E-08 4.44E-07 3.22E-07 -7.15E-07 PASS 7.15E-07 PASS 4.26E-07 2.44E-08 4.93E-07 3.60E-07 -7.65E-07 PASS 7.65E-07 PASS 4.51E-07 2.60E-08 5.22E-07 3.80E-07 -8.15E-07 PASS 8.15E-07 PASS 4.71E-07 5.02E-07 4.97E-07 2.70E-08 2.85E-08 2.82E-08 5.44E-07 5.81E-07 5.75E-07 3.97E-07 4.24E-07 4.20E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 4.97E-07 2.82E-08 5.75E-07 4.20E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 68 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.31. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 69 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.31. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.38E-07 3.47E-07 3.44E-07 3.81E-07 3.89E-07 4.26E-07 4.07E-07 3.64E-07 3.87E-07 3.56E-07 4.07E-07 10 4.81E-07 3.68E-07 3.62E-07 3.97E-07 4.07E-07 4.70E-07 4.55E-07 4.05E-07 4.35E-07 3.96E-07 4.09E-07 20 5.01E-07 3.80E-07 3.74E-07 4.07E-07 4.19E-07 4.95E-07 4.83E-07 4.30E-07 4.63E-07 4.18E-07 4.09E-07 30 5.17E-07 3.88E-07 3.82E-07 4.15E-07 4.28E-07 5.14E-07 5.03E-07 4.49E-07 4.82E-07 4.38E-07 4.08E-07 50 5.45E-07 4.06E-07 3.99E-07 4.31E-07 4.42E-07 5.45E-07 5.37E-07 4.80E-07 5.17E-07 4.70E-07 4.10E-07 60 5.41E-07 4.04E-07 3.97E-07 4.26E-07 4.40E-07 5.40E-07 5.32E-07 4.76E-07 5.11E-07 4.65E-07 4.09E-07 70 5.41E-07 4.04E-07 3.97E-07 4.26E-07 4.40E-07 5.40E-07 5.32E-07 4.76E-07 5.11E-07 4.65E-07 4.09E-07 3.80E-07 3.84E-08 4.85E-07 2.75E-07 4.03E-07 4.77E-08 5.34E-07 2.72E-07 4.16E-07 5.11E-08 5.56E-07 2.76E-07 4.26E-07 5.43E-08 5.75E-07 2.77E-07 4.44E-07 5.91E-08 6.06E-07 2.82E-07 4.42E-07 5.82E-08 6.01E-07 2.82E-07 4.42E-07 5.82E-08 6.01E-07 2.82E-07 3.88E-07 2.92E-08 4.68E-07 3.08E-07 -7.15E-07 PASS 7.15E-07 PASS 4.32E-07 3.17E-08 5.19E-07 3.45E-07 -7.65E-07 PASS 7.65E-07 PASS 4.58E-07 3.30E-08 5.48E-07 3.67E-07 -8.15E-07 PASS 8.15E-07 PASS 4.77E-07 5.10E-07 5.05E-07 3.28E-08 3.36E-08 3.31E-08 5.67E-07 6.02E-07 5.96E-07 3.87E-07 4.18E-07 4.14E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 5.05E-07 3.31E-08 5.96E-07 4.14E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 70 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal Total Dose (krad(Si)) Figure 5.32. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 71 168-hr 70 Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.32. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.98E-07 4.16E-07 3.87E-07 3.76E-07 4.15E-07 3.26E-07 3.90E-07 4.36E-07 3.87E-07 3.70E-07 3.57E-07 10 4.37E-07 4.36E-07 4.06E-07 3.94E-07 4.37E-07 3.59E-07 4.29E-07 4.83E-07 4.43E-07 4.13E-07 3.58E-07 20 4.58E-07 4.50E-07 4.17E-07 4.05E-07 4.48E-07 3.80E-07 4.53E-07 5.09E-07 4.69E-07 4.39E-07 3.59E-07 30 4.73E-07 4.61E-07 4.25E-07 4.14E-07 4.55E-07 3.97E-07 4.70E-07 5.30E-07 4.90E-07 4.58E-07 3.54E-07 50 4.99E-07 4.71E-07 4.41E-07 4.30E-07 4.73E-07 4.26E-07 5.03E-07 5.66E-07 5.22E-07 4.89E-07 3.62E-07 60 4.93E-07 4.70E-07 4.40E-07 4.29E-07 4.72E-07 4.23E-07 4.97E-07 5.61E-07 5.17E-07 4.87E-07 3.61E-07 70 4.93E-07 4.70E-07 4.40E-07 4.29E-07 4.72E-07 4.23E-07 4.97E-07 5.61E-07 5.17E-07 4.87E-07 3.61E-07 3.98E-07 1.71E-08 4.45E-07 3.51E-07 4.22E-07 2.08E-08 4.79E-07 3.65E-07 4.36E-07 2.30E-08 4.99E-07 3.73E-07 4.45E-07 2.51E-08 5.14E-07 3.77E-07 4.63E-07 2.76E-08 5.38E-07 3.87E-07 4.61E-07 2.59E-08 5.32E-07 3.90E-07 4.61E-07 2.59E-08 5.32E-07 3.90E-07 3.82E-07 3.96E-08 4.90E-07 2.73E-07 -7.15E-07 PASS 7.15E-07 PASS 4.25E-07 4.54E-08 5.50E-07 3.01E-07 -7.65E-07 PASS 7.65E-07 PASS 4.50E-07 4.71E-08 5.79E-07 3.21E-07 -8.15E-07 PASS 8.15E-07 PASS 4.69E-07 5.01E-07 4.97E-07 4.85E-08 5.09E-08 5.03E-08 6.02E-07 6.41E-07 6.35E-07 3.36E-07 3.62E-07 3.59E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 4.97E-07 5.03E-08 6.35E-07 3.59E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 72 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal Total Dose (krad(Si)) Figure 5.33. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 73 168-hr 70 Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.33. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.94E-07 4.18E-07 3.96E-07 3.75E-07 4.07E-07 3.37E-07 3.86E-07 4.41E-07 3.92E-07 3.66E-07 3.55E-07 10 4.33E-07 4.38E-07 4.11E-07 3.97E-07 4.28E-07 3.70E-07 4.27E-07 4.89E-07 4.41E-07 4.10E-07 3.58E-07 20 4.52E-07 4.52E-07 4.24E-07 4.07E-07 4.41E-07 3.92E-07 4.50E-07 5.17E-07 4.68E-07 4.35E-07 3.57E-07 30 4.68E-07 4.60E-07 4.32E-07 4.17E-07 4.50E-07 4.10E-07 4.68E-07 5.35E-07 4.86E-07 4.55E-07 3.57E-07 50 4.93E-07 4.77E-07 4.50E-07 4.32E-07 4.67E-07 4.37E-07 5.00E-07 5.72E-07 5.21E-07 4.91E-07 3.59E-07 60 4.88E-07 4.77E-07 4.47E-07 4.32E-07 4.65E-07 4.33E-07 4.96E-07 5.69E-07 5.16E-07 4.84E-07 3.59E-07 70 4.88E-07 4.77E-07 4.47E-07 4.32E-07 4.65E-07 4.33E-07 4.96E-07 5.69E-07 5.16E-07 4.84E-07 3.59E-07 3.98E-07 1.59E-08 4.42E-07 3.54E-07 4.22E-07 1.69E-08 4.68E-07 3.75E-07 4.35E-07 1.96E-08 4.89E-07 3.82E-07 4.45E-07 2.08E-08 5.02E-07 3.88E-07 4.64E-07 2.35E-08 5.29E-07 3.99E-07 4.62E-07 2.27E-08 5.24E-07 4.00E-07 4.62E-07 2.27E-08 5.24E-07 4.00E-07 3.84E-07 3.85E-08 4.90E-07 2.79E-07 -7.15E-07 PASS 7.15E-07 PASS 4.27E-07 4.36E-08 5.47E-07 3.08E-07 -7.65E-07 PASS 7.65E-07 PASS 4.52E-07 4.58E-08 5.78E-07 3.27E-07 -8.15E-07 PASS 8.15E-07 PASS 4.71E-07 5.05E-07 4.99E-07 4.56E-08 4.90E-08 4.93E-08 5.96E-07 6.39E-07 6.35E-07 3.46E-07 3.70E-07 3.64E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 4.99E-07 4.93E-08 6.35E-07 3.64E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 74 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal Total Dose (krad(Si)) Figure 5.34. Plot of Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 75 168-hr 70 Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.34. Raw data for Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.35E-07 3.49E-07 3.48E-07 3.87E-07 3.94E-07 4.14E-07 3.87E-07 3.59E-07 3.79E-07 3.56E-07 4.04E-07 10 4.75E-07 3.70E-07 3.66E-07 4.03E-07 4.11E-07 4.60E-07 4.35E-07 4.01E-07 4.28E-07 3.94E-07 4.06E-07 20 4.96E-07 3.82E-07 3.77E-07 4.15E-07 4.22E-07 4.83E-07 4.62E-07 4.27E-07 4.53E-07 4.16E-07 4.05E-07 30 5.12E-07 3.92E-07 3.85E-07 4.22E-07 4.30E-07 5.05E-07 4.83E-07 4.44E-07 4.74E-07 4.33E-07 4.05E-07 50 5.40E-07 4.10E-07 4.00E-07 4.38E-07 4.43E-07 5.38E-07 5.18E-07 4.76E-07 5.05E-07 4.66E-07 4.07E-07 60 5.35E-07 4.08E-07 3.99E-07 4.34E-07 4.42E-07 5.32E-07 5.13E-07 4.71E-07 5.01E-07 4.61E-07 4.08E-07 70 5.35E-07 4.08E-07 3.99E-07 4.34E-07 4.42E-07 5.32E-07 5.13E-07 4.71E-07 5.01E-07 4.61E-07 4.08E-07 3.82E-07 3.61E-08 4.81E-07 2.83E-07 4.05E-07 4.40E-08 5.26E-07 2.84E-07 4.18E-07 4.79E-08 5.50E-07 2.87E-07 4.28E-07 5.07E-08 5.67E-07 2.89E-07 4.46E-07 5.53E-08 5.98E-07 2.95E-07 4.44E-07 5.41E-08 5.92E-07 2.95E-07 4.44E-07 5.41E-08 5.92E-07 2.95E-07 3.79E-07 2.36E-08 4.44E-07 3.14E-07 -7.15E-07 PASS 7.15E-07 PASS 4.24E-07 2.67E-08 4.97E-07 3.51E-07 -7.65E-07 PASS 7.65E-07 PASS 4.48E-07 2.70E-08 5.22E-07 3.74E-07 -8.15E-07 PASS 8.15E-07 PASS 4.68E-07 5.00E-07 4.96E-07 2.92E-08 2.96E-08 2.91E-08 5.48E-07 5.82E-07 5.75E-07 3.88E-07 4.19E-07 4.16E-07 -8.15E-07 -8.65E-07 -8.65E-07 PASS PASS PASS 8.15E-07 8.65E-07 8.65E-07 PASS PASS PASS 4.96E-07 2.91E-08 5.75E-07 4.16E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 76 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.35. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 77 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.35. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.11E-04 1.56E-05 -2.68E-04 7.05E-05 -1.97E-04 -1.22E-04 -3.35E-04 7.14E-05 -3.50E-05 -5.33E-05 -3.25E-04 10 -3.16E-04 -3.95E-06 -2.88E-04 5.77E-05 -2.20E-04 -1.34E-04 -3.43E-04 5.51E-05 -4.70E-05 -6.33E-05 -3.29E-04 20 -3.01E-04 -1.01E-05 -2.85E-04 6.78E-05 -2.14E-04 -1.34E-04 -3.46E-04 5.38E-05 -4.63E-05 -6.40E-05 -3.30E-04 30 -2.95E-04 -1.53E-05 -2.86E-04 6.86E-05 -2.07E-04 -1.36E-04 -3.49E-04 5.33E-05 -4.62E-05 -6.08E-05 -3.28E-04 50 -2.92E-04 -2.09E-05 -2.91E-04 7.20E-05 -2.03E-04 -1.36E-04 -3.47E-04 5.37E-05 -4.71E-05 -6.14E-05 -3.29E-04 60 -2.93E-04 -1.86E-05 -2.93E-04 8.13E-05 -2.02E-04 -1.34E-04 -3.46E-04 5.56E-05 -5.18E-05 -6.10E-05 -3.32E-04 70 -2.93E-04 -1.86E-05 -2.93E-04 8.13E-05 -2.02E-04 -1.34E-04 -3.46E-04 5.56E-05 -5.18E-05 -6.10E-05 -3.32E-04 -1.38E-04 1.71E-04 3.32E-04 -6.08E-04 -1.54E-04 1.70E-04 3.13E-04 -6.21E-04 -1.48E-04 1.67E-04 3.10E-04 -6.07E-04 -1.47E-04 1.65E-04 3.05E-04 -5.98E-04 -1.47E-04 1.65E-04 3.05E-04 -5.99E-04 -1.45E-04 1.69E-04 3.18E-04 -6.09E-04 -1.45E-04 1.69E-04 3.18E-04 -6.09E-04 -9.49E-05 1.51E-04 3.20E-04 -5.10E-04 -8.00E-04 PASS 8.00E-04 PASS -1.06E-04 1.49E-04 3.01E-04 -5.14E-04 -9.50E-04 PASS 9.50E-04 PASS -1.07E-04 1.49E-04 3.02E-04 -5.17E-04 -9.50E-04 PASS 9.50E-04 PASS -1.08E-04 1.51E-04 3.06E-04 -5.22E-04 -9.50E-04 PASS 9.50E-04 PASS -1.08E-04 1.50E-04 3.04E-04 -5.19E-04 -9.50E-04 PASS 9.50E-04 PASS -1.07E-04 1.50E-04 3.03E-04 -5.17E-04 -9.50E-04 PASS 9.50E-04 PASS -1.07E-04 1.50E-04 3.03E-04 -5.17E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 78 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.36. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 79 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.36. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.64E-04 -1.28E-06 1.16E-04 -1.90E-04 7.49E-05 -2.32E-04 2.43E-05 -1.50E-04 -2.51E-04 -1.67E-04 -2.56E-04 10 2.25E-04 -2.09E-05 1.03E-04 -2.00E-04 4.87E-05 -2.43E-04 2.03E-05 -1.59E-04 -2.49E-04 -1.78E-04 -2.56E-04 20 2.41E-04 -1.18E-05 1.09E-04 -1.89E-04 4.70E-05 -2.38E-04 1.95E-05 -1.58E-04 -2.47E-04 -1.78E-04 -2.56E-04 30 2.45E-04 -7.58E-06 1.12E-04 -1.84E-04 5.52E-05 -2.39E-04 2.41E-05 -1.57E-04 -2.46E-04 -1.79E-04 -2.56E-04 50 2.39E-04 -9.26E-06 1.13E-04 -1.84E-04 4.53E-05 -2.46E-04 2.06E-05 -1.61E-04 -2.53E-04 -1.80E-04 -2.57E-04 60 2.51E-04 -5.29E-06 1.16E-04 -1.75E-04 5.88E-05 -2.40E-04 2.55E-05 -1.58E-04 -2.51E-04 -1.79E-04 -2.57E-04 70 2.51E-04 -5.29E-06 1.16E-04 -1.75E-04 5.88E-05 -2.40E-04 2.55E-05 -1.58E-04 -2.51E-04 -1.79E-04 -2.57E-04 5.29E-05 1.67E-04 5.10E-04 -4.04E-04 3.13E-05 1.58E-04 4.64E-04 -4.01E-04 3.92E-05 1.58E-04 4.73E-04 -3.95E-04 4.40E-05 1.58E-04 4.77E-04 -3.89E-04 4.09E-05 1.56E-04 4.69E-04 -3.87E-04 4.91E-05 1.57E-04 4.79E-04 -3.81E-04 4.91E-05 1.57E-04 4.79E-04 -3.81E-04 -1.55E-04 1.09E-04 1.43E-04 -4.54E-04 -8.00E-04 PASS 8.00E-04 PASS -1.62E-04 1.09E-04 1.37E-04 -4.61E-04 -9.50E-04 PASS 9.50E-04 PASS -1.60E-04 1.07E-04 1.34E-04 -4.55E-04 -9.50E-04 PASS 9.50E-04 PASS -1.59E-04 1.09E-04 1.41E-04 -4.59E-04 -9.50E-04 PASS 9.50E-04 PASS -1.64E-04 1.11E-04 1.40E-04 -4.67E-04 -9.50E-04 PASS 9.50E-04 PASS -1.61E-04 1.11E-04 1.44E-04 -4.65E-04 -9.50E-04 PASS 9.50E-04 PASS -1.61E-04 1.11E-04 1.44E-04 -4.65E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 80 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.37. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 81 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.37. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.34E-04 -3.28E-04 -1.66E-04 -1.07E-04 -9.12E-05 -6.84E-05 6.27E-05 -3.56E-04 -3.55E-04 -4.91E-05 -2.70E-04 10 -1.74E-04 -3.59E-04 -1.78E-04 -1.50E-04 -1.16E-04 -8.21E-05 5.35E-05 -3.65E-04 -3.65E-04 -5.79E-05 -2.70E-04 20 -1.74E-04 -3.60E-04 -1.67E-04 -1.46E-04 -1.12E-04 -8.55E-05 5.02E-05 -3.64E-04 -3.64E-04 -5.53E-05 -2.70E-04 30 -1.77E-04 -3.61E-04 -1.61E-04 -1.45E-04 -1.04E-04 -8.55E-05 5.13E-05 -3.64E-04 -3.64E-04 -5.73E-05 -2.70E-04 50 -1.86E-04 -3.71E-04 -1.54E-04 -1.52E-04 -1.10E-04 -8.74E-05 5.15E-05 -3.61E-04 -3.62E-04 -5.43E-05 -2.70E-04 60 -1.81E-04 -3.67E-04 -1.47E-04 -1.49E-04 -1.05E-04 -8.56E-05 5.28E-05 -3.62E-04 -3.61E-04 -5.44E-05 -2.72E-04 70 -1.81E-04 -3.67E-04 -1.47E-04 -1.49E-04 -1.05E-04 -8.56E-05 5.28E-05 -3.62E-04 -3.61E-04 -5.44E-05 -2.72E-04 -1.65E-04 9.55E-05 9.67E-05 -4.27E-04 -1.95E-04 9.47E-05 6.43E-05 -4.55E-04 -1.92E-04 9.71E-05 7.45E-05 -4.58E-04 -1.89E-04 9.96E-05 8.37E-05 -4.62E-04 -1.95E-04 1.02E-04 8.51E-05 -4.74E-04 -1.90E-04 1.03E-04 9.15E-05 -4.71E-04 -1.90E-04 1.03E-04 9.15E-05 -4.71E-04 -1.53E-04 1.91E-04 3.71E-04 -6.78E-04 -8.00E-04 PASS 8.00E-04 PASS -1.63E-04 1.91E-04 3.61E-04 -6.87E-04 -9.50E-04 PASS 9.50E-04 PASS -1.64E-04 1.90E-04 3.56E-04 -6.84E-04 -9.50E-04 PASS 9.50E-04 PASS -1.64E-04 1.90E-04 3.56E-04 -6.84E-04 -9.50E-04 PASS 9.50E-04 PASS -1.63E-04 1.89E-04 3.55E-04 -6.80E-04 -9.50E-04 PASS 9.50E-04 PASS -1.62E-04 1.89E-04 3.57E-04 -6.81E-04 -9.50E-04 PASS 9.50E-04 PASS -1.62E-04 1.89E-04 3.57E-04 -6.81E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 82 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.38. Plot of Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 83 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.38. Raw data for Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.50E-07 1.35E-04 -4.13E-04 4.01E-05 -1.41E-04 -1.41E-04 -3.81E-04 -2.73E-04 4.93E-05 -1.84E-04 -7.15E-05 10 -3.28E-05 1.22E-04 -4.35E-04 1.78E-05 -1.63E-04 -1.49E-04 -3.84E-04 -2.85E-04 3.77E-05 -1.90E-04 -7.69E-05 20 -2.35E-05 1.23E-04 -4.26E-04 2.40E-05 -1.55E-04 -1.48E-04 -3.80E-04 -2.86E-04 3.71E-05 -1.92E-04 -7.71E-05 30 -1.59E-05 1.25E-04 -4.24E-04 2.79E-05 -1.49E-04 -1.51E-04 -3.82E-04 -2.85E-04 3.74E-05 -1.94E-04 -7.66E-05 50 -1.19E-05 1.21E-04 -4.26E-04 2.88E-05 -1.47E-04 -1.53E-04 -3.84E-04 -2.87E-04 3.63E-05 -1.93E-04 -7.74E-05 60 -4.68E-06 1.31E-04 -4.30E-04 3.10E-05 -1.45E-04 -1.50E-04 -3.83E-04 -2.83E-04 3.98E-05 -1.93E-04 -7.91E-05 70 -4.68E-06 1.31E-04 -4.30E-04 3.10E-05 -1.45E-04 -1.50E-04 -3.83E-04 -2.83E-04 3.98E-05 -1.93E-04 -7.91E-05 -7.57E-05 2.13E-04 5.09E-04 -6.60E-04 -9.83E-05 2.15E-04 4.90E-04 -6.87E-04 -9.14E-05 2.12E-04 4.90E-04 -6.72E-04 -8.72E-05 2.13E-04 4.96E-04 -6.70E-04 -8.71E-05 2.13E-04 4.96E-04 -6.70E-04 -8.35E-05 2.17E-04 5.12E-04 -6.79E-04 -8.35E-05 2.17E-04 5.12E-04 -6.79E-04 -1.86E-04 1.60E-04 2.54E-04 -6.26E-04 -8.00E-04 PASS 8.00E-04 PASS -1.94E-04 1.58E-04 2.40E-04 -6.28E-04 -9.50E-04 PASS 9.50E-04 PASS -1.94E-04 1.57E-04 2.37E-04 -6.24E-04 -9.50E-04 PASS 9.50E-04 PASS -1.95E-04 1.57E-04 2.37E-04 -6.27E-04 -9.50E-04 PASS 9.50E-04 PASS -1.96E-04 1.58E-04 2.36E-04 -6.28E-04 -9.50E-04 PASS 9.50E-04 PASS -1.94E-04 1.58E-04 2.40E-04 -6.28E-04 -9.50E-04 PASS 9.50E-04 PASS -1.94E-04 1.58E-04 2.40E-04 -6.28E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 84 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.39. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 85 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.39. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.88E-10 6.09E-09 -8.06E-10 4.51E-09 -5.61E-10 -3.30E-09 5.21E-10 -5.57E-10 -3.33E-09 -2.20E-09 -9.38E-10 10 1.36E-10 5.67E-09 -1.44E-09 4.34E-09 -9.03E-10 -3.31E-09 2.60E-10 -1.02E-09 -2.82E-09 -2.39E-09 -8.65E-10 20 8.60E-11 5.69E-09 -1.53E-09 4.04E-09 -8.52E-10 -3.29E-09 6.00E-12 -1.30E-09 -2.80E-09 -2.46E-09 -9.19E-10 30 1.52E-10 5.01E-09 -1.21E-09 3.91E-09 -9.78E-10 -3.24E-09 -4.22E-10 -1.01E-09 -2.95E-09 -2.58E-09 -9.36E-10 50 7.29E-10 4.78E-09 -1.75E-09 3.76E-09 -8.76E-10 -3.53E-09 2.95E-10 -4.36E-10 -2.92E-09 -3.01E-09 -8.73E-10 60 6.34E-10 4.65E-09 -1.70E-09 3.76E-09 -1.05E-09 -3.48E-09 -3.00E-11 -4.23E-10 -2.72E-09 -2.92E-09 -9.53E-10 70 6.34E-10 4.65E-09 -1.70E-09 3.76E-09 -1.05E-09 -3.48E-09 -3.00E-11 -4.23E-10 -2.72E-09 -2.92E-09 -9.53E-10 1.92E-09 3.16E-09 1.06E-08 -6.75E-09 1.56E-09 3.23E-09 1.04E-08 -7.30E-09 1.49E-09 3.19E-09 1.02E-08 -7.26E-09 1.38E-09 2.89E-09 9.29E-09 -6.54E-09 1.33E-09 2.85E-09 9.15E-09 -6.49E-09 1.26E-09 2.84E-09 9.04E-09 -6.53E-09 1.26E-09 2.84E-09 9.04E-09 -6.53E-09 -1.77E-09 1.71E-09 2.91E-09 -6.45E-09 -7.00E-08 PASS 7.00E-08 PASS -1.85E-09 1.46E-09 2.14E-09 -5.85E-09 -1.00E-07 PASS 1.00E-07 PASS -1.97E-09 1.32E-09 1.66E-09 -5.60E-09 -1.00E-07 PASS 1.00E-07 PASS -2.04E-09 1.25E-09 1.38E-09 -5.46E-09 -1.00E-07 PASS 1.00E-07 PASS -1.92E-09 1.72E-09 2.81E-09 -6.65E-09 -1.00E-07 PASS 1.00E-07 PASS -1.91E-09 1.57E-09 2.40E-09 -6.22E-09 -1.00E-07 PASS 1.00E-07 PASS -1.91E-09 1.57E-09 2.40E-09 -6.22E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 86 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.40. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 87 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.40. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -7.86E-09 -4.40E-11 1.11E-09 3.27E-09 9.10E-10 -8.18E-10 1.93E-09 3.62E-09 -2.12E-09 2.76E-10 -5.27E-09 10 -8.88E-09 -1.79E-10 6.56E-10 3.28E-09 2.52E-10 -7.29E-10 1.64E-09 3.34E-09 -1.72E-09 4.06E-10 -5.27E-09 20 -8.58E-09 -2.60E-11 5.83E-10 2.90E-09 4.39E-10 -2.66E-10 1.66E-09 3.67E-09 -2.35E-09 4.10E-10 -5.22E-09 30 -8.33E-09 -7.60E-11 5.39E-10 3.00E-09 9.95E-10 -3.53E-10 1.49E-09 3.65E-09 -2.01E-09 1.34E-10 -5.30E-09 50 -8.99E-09 -3.73E-10 4.20E-11 2.62E-09 7.79E-10 -1.26E-09 4.37E-10 3.29E-09 -2.02E-09 3.49E-10 -5.25E-09 60 -8.28E-09 -1.48E-10 -6.30E-11 2.50E-09 9.51E-10 -8.79E-10 1.07E-09 3.56E-09 -1.73E-09 5.55E-10 -5.26E-09 70 -8.28E-09 -1.48E-10 -6.30E-11 2.50E-09 9.51E-10 -8.79E-10 1.07E-09 3.56E-09 -1.73E-09 5.55E-10 -5.26E-09 -5.23E-10 4.28E-09 1.12E-08 -1.22E-08 -9.74E-10 4.62E-09 1.17E-08 -1.36E-08 -9.36E-10 4.42E-09 1.12E-08 -1.31E-08 -7.75E-10 4.38E-09 1.12E-08 -1.28E-08 -1.19E-09 4.51E-09 1.12E-08 -1.36E-08 -1.01E-09 4.20E-09 1.05E-08 -1.25E-08 -1.01E-09 4.20E-09 1.05E-08 -1.25E-08 5.77E-10 2.26E-09 6.77E-09 -5.61E-09 -7.00E-08 PASS 7.00E-08 PASS 5.87E-10 1.99E-09 6.03E-09 -4.86E-09 -1.00E-07 PASS 1.00E-07 PASS 6.23E-10 2.24E-09 6.76E-09 -5.51E-09 -1.00E-07 PASS 1.00E-07 PASS 5.81E-10 2.12E-09 6.40E-09 -5.23E-09 -1.00E-07 PASS 1.00E-07 PASS 1.58E-10 2.04E-09 5.75E-09 -5.43E-09 -1.00E-07 PASS 1.00E-07 PASS 5.15E-10 2.03E-09 6.09E-09 -5.06E-09 -1.00E-07 PASS 1.00E-07 PASS 5.15E-10 2.03E-09 6.09E-09 -5.06E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 88 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.41. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 89 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.41. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.05E-09 -1.81E-09 4.40E-09 -1.74E-09 -2.98E-09 -4.15E-09 -2.26E-09 7.09E-10 -1.15E-10 2.95E-09 1.98E-09 10 -1.45E-09 -1.95E-09 4.48E-09 -2.50E-09 -2.83E-09 -4.40E-09 -2.39E-09 7.29E-10 -4.88E-10 2.70E-09 1.92E-09 20 -1.78E-09 -1.95E-09 4.49E-09 -2.52E-09 -2.52E-09 -4.40E-09 -2.43E-09 4.24E-10 -3.20E-11 2.65E-09 1.95E-09 30 -1.61E-09 -1.62E-09 4.48E-09 -2.58E-09 -2.52E-09 -4.19E-09 -2.22E-09 1.29E-09 1.19E-10 3.11E-09 1.99E-09 50 -1.67E-09 -2.13E-09 4.27E-09 -2.85E-09 -2.62E-09 -3.81E-09 -2.60E-09 1.41E-09 7.09E-10 2.90E-09 1.93E-09 60 -1.52E-09 -1.98E-09 4.42E-09 -2.79E-09 -2.55E-09 -3.33E-09 -1.89E-09 1.28E-09 5.33E-10 2.57E-09 1.95E-09 70 -1.52E-09 -1.98E-09 4.42E-09 -2.79E-09 -2.55E-09 -3.33E-09 -1.89E-09 1.28E-09 5.33E-10 2.57E-09 1.95E-09 -6.36E-10 2.90E-09 7.31E-09 -8.59E-09 -8.49E-10 3.03E-09 7.45E-09 -9.15E-09 -8.58E-10 3.01E-09 7.39E-09 -9.10E-09 -7.70E-10 2.97E-09 7.38E-09 -8.92E-09 -1.00E-09 2.98E-09 7.17E-09 -9.17E-09 -8.82E-10 3.01E-09 7.36E-09 -9.13E-09 -8.82E-10 3.01E-09 7.36E-09 -9.13E-09 -5.73E-10 2.74E-09 6.93E-09 -8.08E-09 -7.00E-08 PASS 7.00E-08 PASS -7.71E-10 2.75E-09 6.76E-09 -8.30E-09 -1.00E-07 PASS 1.00E-07 PASS -7.56E-10 2.72E-09 6.70E-09 -8.21E-09 -1.00E-07 PASS 1.00E-07 PASS -3.77E-10 2.87E-09 7.51E-09 -8.26E-09 -1.00E-07 PASS 1.00E-07 PASS -2.79E-10 2.82E-09 7.45E-09 -8.01E-09 -1.00E-07 PASS 1.00E-07 PASS -1.68E-10 2.40E-09 6.41E-09 -6.74E-09 -1.00E-07 PASS 1.00E-07 PASS -1.68E-10 2.40E-09 6.41E-09 -6.74E-09 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 90 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-07 1.00E-07 5.00E-08 0.00E+00 -5.00E-08 -1.00E-07 -1.50E-07 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.42. Plot of Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 91 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.42. Raw data for Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.23E-09 2.87E-09 -4.52E-09 -1.32E-09 -1.27E-09 -2.23E-09 8.51E-10 -1.11E-08 -4.01E-09 -4.66E-09 -4.54E-10 10 -1.69E-09 3.50E-09 -4.42E-09 -9.95E-10 -1.21E-09 -2.69E-09 9.44E-10 -1.16E-08 -4.05E-09 -4.18E-09 -3.95E-10 20 -1.73E-09 3.22E-09 -4.66E-09 -1.01E-09 -1.56E-09 -2.42E-09 2.77E-10 -1.18E-08 -4.13E-09 -4.06E-09 -4.98E-10 30 -1.70E-09 3.49E-09 -4.65E-09 -1.04E-09 -1.33E-09 -2.40E-09 8.79E-10 -1.17E-08 -3.22E-09 -4.85E-09 -4.54E-10 50 -1.72E-09 3.54E-09 -4.25E-09 -3.39E-10 -1.99E-09 -2.50E-09 1.39E-09 -1.10E-08 -3.21E-09 -4.30E-09 -5.41E-10 60 -1.79E-09 3.34E-09 -4.28E-09 -2.70E-10 -1.90E-09 -2.37E-09 9.01E-10 -1.06E-08 -3.42E-09 -4.11E-09 -5.03E-10 70 -1.79E-09 3.34E-09 -4.28E-09 -2.70E-10 -1.90E-09 -2.37E-09 9.01E-10 -1.06E-08 -3.42E-09 -4.11E-09 -5.03E-10 -1.09E-09 2.63E-09 6.11E-09 -8.30E-09 -9.62E-10 2.85E-09 6.84E-09 -8.77E-09 -1.15E-09 2.83E-09 6.60E-09 -8.90E-09 -1.05E-09 2.92E-09 6.96E-09 -9.05E-09 -9.53E-10 2.88E-09 6.94E-09 -8.85E-09 -9.79E-10 2.81E-09 6.72E-09 -8.67E-09 -9.79E-10 2.81E-09 6.72E-09 -8.67E-09 -4.24E-09 4.41E-09 7.85E-09 -1.63E-08 -7.00E-08 PASS 7.00E-08 PASS -4.32E-09 4.57E-09 8.23E-09 -1.69E-08 -1.00E-07 PASS 1.00E-07 PASS -4.42E-09 4.49E-09 7.89E-09 -1.67E-08 -1.00E-07 PASS 1.00E-07 PASS -4.27E-09 4.67E-09 8.55E-09 -1.71E-08 -1.00E-07 PASS 1.00E-07 PASS -3.92E-09 4.50E-09 8.41E-09 -1.63E-08 -1.00E-07 PASS 1.00E-07 PASS -3.92E-09 4.21E-09 7.62E-09 -1.55E-08 -1.00E-07 PASS 1.00E-07 PASS -3.92E-09 4.21E-09 7.62E-09 -1.55E-08 -1.00E-07 PASS 1.00E-07 PASS An ISO 9001:2000 Certified Company 92 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.43. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 93 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.43. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.12E-07 -2.87E-07 -2.83E-07 -3.01E-07 -3.14E-07 -3.16E-07 -3.11E-07 -2.98E-07 -2.91E-07 -2.90E-07 -3.01E-07 10 -3.26E-07 -2.92E-07 -2.88E-07 -3.07E-07 -3.20E-07 -3.30E-07 -3.27E-07 -3.13E-07 -3.06E-07 -3.04E-07 -3.03E-07 20 -3.29E-07 -2.96E-07 -2.92E-07 -3.10E-07 -3.22E-07 -3.35E-07 -3.35E-07 -3.20E-07 -3.12E-07 -3.10E-07 -3.04E-07 30 -3.29E-07 -2.98E-07 -2.93E-07 -3.11E-07 -3.23E-07 -3.40E-07 -3.40E-07 -3.25E-07 -3.17E-07 -3.15E-07 -3.03E-07 50 -3.33E-07 -3.03E-07 -2.97E-07 -3.15E-07 -3.27E-07 -3.52E-07 -3.51E-07 -3.33E-07 -3.25E-07 -3.24E-07 -3.03E-07 60 -3.28E-07 -2.99E-07 -2.94E-07 -3.10E-07 -3.23E-07 -3.48E-07 -3.50E-07 -3.30E-07 -3.23E-07 -3.21E-07 -3.04E-07 70 -3.28E-07 -2.99E-07 -2.94E-07 -3.10E-07 -3.23E-07 -3.48E-07 -3.50E-07 -3.30E-07 -3.23E-07 -3.21E-07 -3.04E-07 -2.99E-07 1.41E-08 -2.61E-07 -3.38E-07 -3.07E-07 1.63E-08 -2.62E-07 -3.51E-07 -3.10E-07 1.60E-08 -2.66E-07 -3.54E-07 -3.11E-07 1.57E-08 -2.68E-07 -3.54E-07 -3.15E-07 1.53E-08 -2.73E-07 -3.57E-07 -3.11E-07 1.46E-08 -2.70E-07 -3.51E-07 -3.11E-07 1.46E-08 -2.70E-07 -3.51E-07 -3.01E-07 1.18E-08 -2.69E-07 -3.34E-07 -7.15E-07 PASS 7.15E-07 PASS -3.16E-07 1.19E-08 -2.84E-07 -3.49E-07 -7.65E-07 PASS 7.65E-07 PASS -3.22E-07 1.19E-08 -2.90E-07 -3.55E-07 -8.15E-07 PASS 8.15E-07 PASS -3.27E-07 1.19E-08 -2.95E-07 -3.60E-07 -8.15E-07 PASS 8.15E-07 PASS -3.37E-07 1.37E-08 -2.99E-07 -3.75E-07 -8.65E-07 PASS 8.65E-07 PASS -3.34E-07 1.37E-08 -2.97E-07 -3.72E-07 -8.65E-07 PASS 8.65E-07 PASS -3.34E-07 1.37E-08 -2.97E-07 -3.72E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 94 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.44. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 95 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.44. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.99E-07 -2.93E-07 -2.97E-07 -2.74E-07 -2.95E-07 -2.83E-07 -3.11E-07 -3.24E-07 -2.95E-07 -2.96E-07 -2.89E-07 10 -3.14E-07 -2.98E-07 -3.02E-07 -2.80E-07 -3.00E-07 -2.96E-07 -3.24E-07 -3.39E-07 -3.10E-07 -3.11E-07 -2.90E-07 20 -3.16E-07 -3.01E-07 -3.05E-07 -2.82E-07 -3.03E-07 -3.02E-07 -3.30E-07 -3.49E-07 -3.16E-07 -3.17E-07 -2.91E-07 30 -3.16E-07 -3.02E-07 -3.06E-07 -2.82E-07 -3.03E-07 -3.06E-07 -3.33E-07 -3.54E-07 -3.21E-07 -3.22E-07 -2.91E-07 50 -3.21E-07 -3.06E-07 -3.11E-07 -2.85E-07 -3.07E-07 -3.15E-07 -3.41E-07 -3.63E-07 -3.29E-07 -3.31E-07 -2.90E-07 60 -3.14E-07 -3.02E-07 -3.07E-07 -2.82E-07 -3.03E-07 -3.12E-07 -3.38E-07 -3.60E-07 -3.26E-07 -3.29E-07 -2.91E-07 70 -3.14E-07 -3.02E-07 -3.07E-07 -2.82E-07 -3.03E-07 -3.12E-07 -3.38E-07 -3.60E-07 -3.26E-07 -3.29E-07 -2.91E-07 -2.92E-07 1.01E-08 -2.64E-07 -3.19E-07 -2.99E-07 1.22E-08 -2.65E-07 -3.32E-07 -3.01E-07 1.25E-08 -2.67E-07 -3.36E-07 -3.02E-07 1.23E-08 -2.68E-07 -3.35E-07 -3.06E-07 1.29E-08 -2.71E-07 -3.41E-07 -3.02E-07 1.21E-08 -2.68E-07 -3.35E-07 -3.02E-07 1.21E-08 -2.68E-07 -3.35E-07 -3.02E-07 1.58E-08 -2.58E-07 -3.45E-07 -7.15E-07 PASS 7.15E-07 PASS -3.16E-07 1.62E-08 -2.72E-07 -3.61E-07 -7.65E-07 PASS 7.65E-07 PASS -3.23E-07 1.77E-08 -2.74E-07 -3.71E-07 -8.15E-07 PASS 8.15E-07 PASS -3.27E-07 1.79E-08 -2.78E-07 -3.76E-07 -8.15E-07 PASS 8.15E-07 PASS -3.36E-07 1.78E-08 -2.87E-07 -3.85E-07 -8.65E-07 PASS 8.65E-07 PASS -3.33E-07 1.78E-08 -2.84E-07 -3.82E-07 -8.65E-07 PASS 8.65E-07 PASS -3.33E-07 1.78E-08 -2.84E-07 -3.82E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 96 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.45. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 97 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.45. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.86E-07 -2.94E-07 -2.99E-07 -2.79E-07 -2.94E-07 -2.86E-07 -3.13E-07 -3.27E-07 -2.94E-07 -2.95E-07 -2.86E-07 10 -3.00E-07 -2.99E-07 -3.03E-07 -2.85E-07 -2.99E-07 -3.00E-07 -3.26E-07 -3.47E-07 -3.09E-07 -3.10E-07 -2.88E-07 20 -3.03E-07 -3.03E-07 -3.07E-07 -2.88E-07 -3.02E-07 -3.05E-07 -3.32E-07 -3.53E-07 -3.16E-07 -3.17E-07 -2.88E-07 30 -3.03E-07 -3.04E-07 -3.08E-07 -2.88E-07 -3.02E-07 -3.10E-07 -3.36E-07 -3.58E-07 -3.20E-07 -3.22E-07 -2.88E-07 50 -3.07E-07 -3.09E-07 -3.12E-07 -2.91E-07 -3.06E-07 -3.18E-07 -3.46E-07 -3.65E-07 -3.28E-07 -3.31E-07 -2.87E-07 60 -3.02E-07 -3.05E-07 -3.08E-07 -2.87E-07 -3.02E-07 -3.15E-07 -3.40E-07 -3.64E-07 -3.26E-07 -3.29E-07 -2.88E-07 70 -3.02E-07 -3.05E-07 -3.08E-07 -2.87E-07 -3.02E-07 -3.15E-07 -3.40E-07 -3.64E-07 -3.26E-07 -3.29E-07 -2.88E-07 -2.90E-07 7.68E-09 -2.69E-07 -3.11E-07 -2.97E-07 7.13E-09 -2.78E-07 -3.17E-07 -3.00E-07 7.34E-09 -2.80E-07 -3.20E-07 -3.01E-07 7.44E-09 -2.81E-07 -3.21E-07 -3.05E-07 8.31E-09 -2.82E-07 -3.28E-07 -3.01E-07 8.14E-09 -2.79E-07 -3.23E-07 -3.01E-07 8.14E-09 -2.79E-07 -3.23E-07 -3.03E-07 1.64E-08 -2.58E-07 -3.48E-07 -7.15E-07 PASS 7.15E-07 PASS -3.18E-07 1.84E-08 -2.68E-07 -3.69E-07 -7.65E-07 PASS 7.65E-07 PASS -3.24E-07 1.84E-08 -2.74E-07 -3.75E-07 -8.15E-07 PASS 8.15E-07 PASS -3.29E-07 1.84E-08 -2.79E-07 -3.80E-07 -8.15E-07 PASS 8.15E-07 PASS -3.38E-07 1.84E-08 -2.87E-07 -3.88E-07 -8.65E-07 PASS 8.65E-07 PASS -3.35E-07 1.85E-08 -2.84E-07 -3.86E-07 -8.65E-07 PASS 8.65E-07 PASS -3.35E-07 1.85E-08 -2.84E-07 -3.86E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 98 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.46. Plot of Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 99 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.46. Raw data for Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.20E-07 -2.83E-07 -2.85E-07 -2.98E-07 -3.13E-07 -3.12E-07 -3.17E-07 -3.06E-07 -2.88E-07 -2.89E-07 -2.99E-07 10 -3.34E-07 -2.88E-07 -2.90E-07 -3.04E-07 -3.18E-07 -3.25E-07 -3.32E-07 -3.21E-07 -3.02E-07 -3.03E-07 -3.01E-07 20 -3.37E-07 -2.92E-07 -2.93E-07 -3.06E-07 -3.21E-07 -3.31E-07 -3.39E-07 -3.27E-07 -3.09E-07 -3.09E-07 -3.01E-07 30 -3.37E-07 -2.93E-07 -2.94E-07 -3.07E-07 -3.21E-07 -3.35E-07 -3.47E-07 -3.32E-07 -3.13E-07 -3.14E-07 -3.01E-07 50 -3.42E-07 -2.98E-07 -2.99E-07 -3.10E-07 -3.25E-07 -3.45E-07 -3.54E-07 -3.40E-07 -3.21E-07 -3.22E-07 -3.00E-07 60 -3.37E-07 -2.94E-07 -2.95E-07 -3.06E-07 -3.21E-07 -3.40E-07 -3.53E-07 -3.37E-07 -3.19E-07 -3.20E-07 -3.01E-07 70 -3.37E-07 -2.94E-07 -2.95E-07 -3.06E-07 -3.21E-07 -3.40E-07 -3.53E-07 -3.37E-07 -3.19E-07 -3.20E-07 -3.01E-07 -3.00E-07 1.64E-08 -2.55E-07 -3.45E-07 -3.07E-07 1.94E-08 -2.54E-07 -3.60E-07 -3.10E-07 1.91E-08 -2.57E-07 -3.62E-07 -3.11E-07 1.88E-08 -2.59E-07 -3.62E-07 -3.15E-07 1.89E-08 -2.63E-07 -3.67E-07 -3.10E-07 1.82E-08 -2.61E-07 -3.60E-07 -3.10E-07 1.82E-08 -2.61E-07 -3.60E-07 -3.02E-07 1.32E-08 -2.66E-07 -3.39E-07 -7.15E-07 PASS 7.15E-07 PASS -3.17E-07 1.34E-08 -2.80E-07 -3.54E-07 -7.65E-07 PASS 7.65E-07 PASS -3.23E-07 1.35E-08 -2.86E-07 -3.60E-07 -8.15E-07 PASS 8.15E-07 PASS -3.28E-07 1.43E-08 -2.89E-07 -3.68E-07 -8.15E-07 PASS 8.15E-07 PASS -3.37E-07 1.44E-08 -2.97E-07 -3.76E-07 -8.65E-07 PASS 8.65E-07 PASS -3.34E-07 1.43E-08 -2.95E-07 -3.73E-07 -8.65E-07 PASS 8.65E-07 PASS -3.34E-07 1.43E-08 -2.95E-07 -3.73E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 100 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.47. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 101 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.47. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.12E-07 -2.92E-07 -2.82E-07 -3.05E-07 -3.13E-07 -3.12E-07 -3.11E-07 -2.97E-07 -2.87E-07 -2.87E-07 -3.00E-07 10 -3.25E-07 -2.97E-07 -2.87E-07 -3.11E-07 -3.18E-07 -3.26E-07 -3.27E-07 -3.11E-07 -3.02E-07 -3.01E-07 -3.02E-07 20 -3.28E-07 -3.01E-07 -2.90E-07 -3.14E-07 -3.21E-07 -3.31E-07 -3.34E-07 -3.17E-07 -3.09E-07 -3.07E-07 -3.02E-07 30 -3.29E-07 -3.02E-07 -2.91E-07 -3.14E-07 -3.22E-07 -3.36E-07 -3.39E-07 -3.23E-07 -3.14E-07 -3.12E-07 -3.02E-07 50 -3.34E-07 -3.07E-07 -2.95E-07 -3.18E-07 -3.26E-07 -3.48E-07 -3.52E-07 -3.32E-07 -3.22E-07 -3.20E-07 -3.01E-07 60 -3.28E-07 -3.03E-07 -2.92E-07 -3.13E-07 -3.21E-07 -3.45E-07 -3.50E-07 -3.29E-07 -3.19E-07 -3.18E-07 -3.02E-07 70 -3.28E-07 -3.03E-07 -2.92E-07 -3.13E-07 -3.21E-07 -3.45E-07 -3.50E-07 -3.29E-07 -3.19E-07 -3.18E-07 -3.02E-07 -3.01E-07 1.35E-08 -2.64E-07 -3.38E-07 -3.08E-07 1.57E-08 -2.65E-07 -3.51E-07 -3.11E-07 1.54E-08 -2.69E-07 -3.53E-07 -3.12E-07 1.51E-08 -2.70E-07 -3.53E-07 -3.16E-07 1.51E-08 -2.75E-07 -3.58E-07 -3.12E-07 1.44E-08 -2.72E-07 -3.51E-07 -3.12E-07 1.44E-08 -2.72E-07 -3.51E-07 -2.99E-07 1.23E-08 -2.65E-07 -3.33E-07 -7.15E-07 PASS 7.15E-07 PASS -3.13E-07 1.23E-08 -2.80E-07 -3.47E-07 -7.65E-07 PASS 7.65E-07 PASS -3.20E-07 1.24E-08 -2.86E-07 -3.54E-07 -8.15E-07 PASS 8.15E-07 PASS -3.25E-07 1.23E-08 -2.91E-07 -3.58E-07 -8.15E-07 PASS 8.15E-07 PASS -3.35E-07 1.47E-08 -2.94E-07 -3.75E-07 -8.65E-07 PASS 8.65E-07 PASS -3.32E-07 1.47E-08 -2.92E-07 -3.73E-07 -8.65E-07 PASS 8.65E-07 PASS -3.32E-07 1.47E-08 -2.92E-07 -3.73E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 102 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.48. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 103 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.48. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.91E-07 -2.93E-07 -2.98E-07 -2.77E-07 -2.95E-07 -2.82E-07 -3.12E-07 -3.27E-07 -2.92E-07 -2.96E-07 -2.83E-07 10 -3.04E-07 -2.97E-07 -3.02E-07 -2.83E-07 -3.00E-07 -2.95E-07 -3.25E-07 -3.49E-07 -3.08E-07 -3.11E-07 -2.85E-07 20 -3.07E-07 -3.01E-07 -3.05E-07 -2.84E-07 -3.03E-07 -3.01E-07 -3.31E-07 -3.56E-07 -3.13E-07 -3.18E-07 -2.85E-07 30 -3.07E-07 -3.02E-07 -3.06E-07 -2.85E-07 -3.04E-07 -3.05E-07 -3.34E-07 -3.60E-07 -3.19E-07 -3.22E-07 -2.84E-07 50 -3.11E-07 -3.06E-07 -3.11E-07 -2.88E-07 -3.07E-07 -3.13E-07 -3.41E-07 -3.67E-07 -3.27E-07 -3.31E-07 -2.84E-07 60 -3.06E-07 -3.02E-07 -3.07E-07 -2.84E-07 -3.04E-07 -3.11E-07 -3.38E-07 -3.65E-07 -3.25E-07 -3.29E-07 -2.85E-07 70 -3.06E-07 -3.02E-07 -3.07E-07 -2.84E-07 -3.04E-07 -3.11E-07 -3.38E-07 -3.65E-07 -3.25E-07 -3.29E-07 -2.85E-07 -2.91E-07 8.02E-09 -2.69E-07 -3.13E-07 -2.97E-07 8.55E-09 -2.74E-07 -3.21E-07 -3.00E-07 9.16E-09 -2.75E-07 -3.25E-07 -3.01E-07 9.07E-09 -2.76E-07 -3.26E-07 -3.05E-07 9.60E-09 -2.78E-07 -3.31E-07 -3.01E-07 9.27E-09 -2.75E-07 -3.26E-07 -3.01E-07 9.27E-09 -2.75E-07 -3.26E-07 -3.02E-07 1.77E-08 -2.53E-07 -3.50E-07 -7.15E-07 PASS 7.15E-07 PASS -3.18E-07 2.05E-08 -2.61E-07 -3.74E-07 -7.65E-07 PASS 7.65E-07 PASS -3.24E-07 2.08E-08 -2.67E-07 -3.81E-07 -8.15E-07 PASS 8.15E-07 PASS -3.28E-07 2.07E-08 -2.71E-07 -3.85E-07 -8.15E-07 PASS 8.15E-07 PASS -3.36E-07 2.02E-08 -2.80E-07 -3.91E-07 -8.65E-07 PASS 8.65E-07 PASS -3.33E-07 2.02E-08 -2.78E-07 -3.89E-07 -8.65E-07 PASS 8.65E-07 PASS -3.33E-07 2.02E-08 -2.78E-07 -3.89E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 104 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.49. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 105 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.49. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.85E-07 -2.92E-07 -3.03E-07 -2.77E-07 -2.90E-07 -2.82E-07 -3.10E-07 -3.26E-07 -2.93E-07 -2.98E-07 -2.88E-07 10 -2.99E-07 -2.97E-07 -3.08E-07 -2.83E-07 -2.96E-07 -2.95E-07 -3.23E-07 -3.48E-07 -3.08E-07 -3.12E-07 -2.89E-07 20 -3.01E-07 -3.00E-07 -3.11E-07 -2.85E-07 -2.99E-07 -3.01E-07 -3.29E-07 -3.54E-07 -3.15E-07 -3.19E-07 -2.90E-07 30 -3.01E-07 -3.02E-07 -3.12E-07 -2.85E-07 -3.00E-07 -3.05E-07 -3.33E-07 -3.60E-07 -3.20E-07 -3.24E-07 -2.89E-07 50 -3.05E-07 -3.06E-07 -3.16E-07 -2.88E-07 -3.03E-07 -3.14E-07 -3.40E-07 -3.68E-07 -3.29E-07 -3.33E-07 -2.89E-07 60 -3.00E-07 -3.03E-07 -3.12E-07 -2.84E-07 -2.99E-07 -3.11E-07 -3.38E-07 -3.66E-07 -3.26E-07 -3.31E-07 -2.90E-07 70 -3.00E-07 -3.03E-07 -3.12E-07 -2.84E-07 -2.99E-07 -3.11E-07 -3.38E-07 -3.66E-07 -3.26E-07 -3.31E-07 -2.90E-07 -2.89E-07 9.40E-09 -2.64E-07 -3.15E-07 -2.96E-07 8.96E-09 -2.72E-07 -3.21E-07 -2.99E-07 9.41E-09 -2.73E-07 -3.25E-07 -3.00E-07 9.44E-09 -2.74E-07 -3.26E-07 -3.04E-07 1.04E-08 -2.75E-07 -3.32E-07 -3.00E-07 1.02E-08 -2.72E-07 -3.28E-07 -3.00E-07 1.02E-08 -2.72E-07 -3.28E-07 -3.02E-07 1.70E-08 -2.55E-07 -3.48E-07 -7.15E-07 PASS 7.15E-07 PASS -3.17E-07 2.01E-08 -2.62E-07 -3.72E-07 -7.65E-07 PASS 7.65E-07 PASS -3.24E-07 1.98E-08 -2.69E-07 -3.78E-07 -8.15E-07 PASS 8.15E-07 PASS -3.29E-07 2.03E-08 -2.73E-07 -3.84E-07 -8.15E-07 PASS 8.15E-07 PASS -3.37E-07 1.97E-08 -2.83E-07 -3.91E-07 -8.65E-07 PASS 8.65E-07 PASS -3.34E-07 2.01E-08 -2.79E-07 -3.90E-07 -8.65E-07 PASS 8.65E-07 PASS -3.34E-07 2.01E-08 -2.79E-07 -3.90E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 106 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.50. Plot of Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 107 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.50. Raw data for Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.19E-07 -2.86E-07 -2.80E-07 -2.97E-07 -3.12E-07 -3.09E-07 -3.17E-07 -2.95E-07 -2.83E-07 -2.84E-07 -2.98E-07 10 -3.32E-07 -2.91E-07 -2.86E-07 -3.03E-07 -3.16E-07 -3.22E-07 -3.33E-07 -3.08E-07 -2.98E-07 -2.99E-07 -3.00E-07 20 -3.35E-07 -2.95E-07 -2.88E-07 -3.05E-07 -3.19E-07 -3.28E-07 -3.39E-07 -3.15E-07 -3.04E-07 -3.05E-07 -3.01E-07 30 -3.36E-07 -2.96E-07 -2.90E-07 -3.06E-07 -3.20E-07 -3.32E-07 -3.50E-07 -3.20E-07 -3.10E-07 -3.09E-07 -3.00E-07 50 -3.40E-07 -3.01E-07 -2.94E-07 -3.10E-07 -3.23E-07 -3.40E-07 -3.58E-07 -3.29E-07 -3.18E-07 -3.18E-07 -2.99E-07 60 -3.35E-07 -2.97E-07 -2.91E-07 -3.05E-07 -3.19E-07 -3.37E-07 -3.55E-07 -3.26E-07 -3.15E-07 -3.15E-07 -3.00E-07 70 -3.35E-07 -2.97E-07 -2.91E-07 -3.05E-07 -3.19E-07 -3.37E-07 -3.55E-07 -3.26E-07 -3.15E-07 -3.15E-07 -3.00E-07 -2.99E-07 1.64E-08 -2.54E-07 -3.44E-07 -3.06E-07 1.88E-08 -2.54E-07 -3.57E-07 -3.08E-07 1.88E-08 -2.57E-07 -3.60E-07 -3.09E-07 1.85E-08 -2.59E-07 -3.60E-07 -3.14E-07 1.82E-08 -2.64E-07 -3.64E-07 -3.09E-07 1.76E-08 -2.61E-07 -3.58E-07 -3.09E-07 1.76E-08 -2.61E-07 -3.58E-07 -2.98E-07 1.50E-08 -2.57E-07 -3.39E-07 -7.15E-07 PASS 7.15E-07 PASS -3.12E-07 1.52E-08 -2.70E-07 -3.54E-07 -7.65E-07 PASS 7.65E-07 PASS -3.18E-07 1.51E-08 -2.77E-07 -3.60E-07 -8.15E-07 PASS 8.15E-07 PASS -3.24E-07 1.72E-08 -2.77E-07 -3.71E-07 -8.15E-07 PASS 8.15E-07 PASS -3.32E-07 1.72E-08 -2.85E-07 -3.80E-07 -8.65E-07 PASS 8.65E-07 PASS -3.30E-07 1.68E-08 -2.84E-07 -3.76E-07 -8.65E-07 PASS 8.65E-07 PASS -3.30E-07 1.68E-08 -2.84E-07 -3.76E-07 -8.65E-07 PASS 8.65E-07 PASS An ISO 9001:2000 Certified Company 108 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E+03 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.51. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 109 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.51. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.49E+03 3.78E+03 6.37E+03 3.68E+03 6.26E+03 6.28E+03 3.53E+03 6.03E+03 3.60E+03 6.13E+03 6.17E+03 10 3.42E+03 3.53E+03 6.06E+03 3.16E+03 6.13E+03 5.56E+03 3.36E+03 6.20E+03 3.53E+03 6.13E+03 6.19E+03 20 3.42E+03 3.57E+03 6.35E+03 3.35E+03 5.68E+03 5.34E+03 3.47E+03 5.36E+03 3.58E+03 6.19E+03 5.88E+03 30 3.35E+03 3.39E+03 6.11E+03 3.22E+03 5.56E+03 4.89E+03 3.47E+03 5.26E+03 3.33E+03 5.20E+03 6.13E+03 50 3.35E+03 3.45E+03 5.87E+03 3.11E+03 5.48E+03 6.18E+03 3.38E+03 5.10E+03 3.23E+03 5.34E+03 5.69E+03 60 3.22E+03 3.45E+03 6.06E+03 3.45E+03 5.60E+03 5.47E+03 3.38E+03 5.20E+03 3.38E+03 5.40E+03 5.75E+03 70 3.22E+03 3.45E+03 6.06E+03 3.45E+03 5.60E+03 5.47E+03 3.38E+03 5.20E+03 3.38E+03 5.40E+03 5.75E+03 4.71E+03 1.47E+03 8.73E+03 6.96E+02 4.46E+03 1.50E+03 8.58E+03 3.43E+02 4.47E+03 1.43E+03 8.39E+03 5.51E+02 4.33E+03 1.39E+03 8.15E+03 5.02E+02 4.25E+03 1.31E+03 7.85E+03 6.53E+02 4.35E+03 1.36E+03 8.08E+03 6.31E+02 4.35E+03 1.36E+03 8.08E+03 6.31E+02 5.11E+03 1.42E+03 9.00E+03 1.23E+03 1.00E+03 FAIL 4.96E+03 1.40E+03 8.79E+03 1.12E+03 5.00E+02 FAIL 4.78E+03 1.20E+03 8.08E+03 1.48E+03 5.00E+02 PASS 4.43E+03 9.54E+02 7.05E+03 1.82E+03 5.00E+02 PASS 4.65E+03 1.29E+03 8.19E+03 1.11E+03 5.00E+02 PASS 4.57E+03 1.09E+03 7.54E+03 1.59E+03 5.00E+02 PASS 4.57E+03 1.09E+03 7.54E+03 1.59E+03 5.00E+02 PASS An ISO 9001:2000 Certified Company 110 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E+03 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.52. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 111 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.52. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 3.56E+03 3.73E+03 3.63E+03 4.87E+03 3.79E+03 4.82E+03 5.66E+03 5.92E+03 5.69E+03 4.13E+03 6.12E+03 10 3.49E+03 3.50E+03 3.41E+03 4.64E+03 3.42E+03 5.14E+03 5.67E+03 5.95E+03 5.39E+03 4.44E+03 5.47E+03 20 3.43E+03 3.54E+03 3.46E+03 4.42E+03 3.66E+03 4.76E+03 5.08E+03 6.01E+03 5.03E+03 3.88E+03 5.70E+03 30 3.24E+03 3.45E+03 3.36E+03 4.54E+03 3.40E+03 4.91E+03 5.17E+03 5.40E+03 5.32E+03 2.96E+03 4.55E+03 50 3.35E+03 3.47E+03 3.29E+03 4.28E+03 3.36E+03 4.21E+03 5.09E+03 4.99E+03 5.36E+03 4.69E+03 5.14E+03 60 3.28E+03 3.27E+03 3.23E+03 4.21E+03 3.48E+03 4.86E+03 4.79E+03 5.69E+03 5.38E+03 3.78E+03 5.38E+03 70 3.28E+03 3.27E+03 3.23E+03 4.21E+03 3.48E+03 4.86E+03 4.79E+03 5.69E+03 5.38E+03 3.78E+03 5.38E+03 3.92E+03 5.42E+02 5.40E+03 2.43E+03 3.69E+03 5.31E+02 5.15E+03 2.24E+03 3.70E+03 4.12E+02 4.83E+03 2.57E+03 3.60E+03 5.32E+02 5.05E+03 2.14E+03 3.55E+03 4.12E+02 4.68E+03 2.42E+03 3.49E+03 4.11E+02 4.62E+03 2.37E+03 3.49E+03 4.11E+02 4.62E+03 2.37E+03 5.24E+03 7.50E+02 7.30E+03 3.19E+03 1.00E+03 PASS 5.32E+03 5.78E+02 6.90E+03 3.73E+03 5.00E+02 PASS 4.95E+03 7.63E+02 7.04E+03 2.86E+03 5.00E+02 PASS 4.75E+03 1.02E+03 7.54E+03 1.96E+03 5.00E+02 PASS 4.87E+03 4.38E+02 6.07E+03 3.67E+03 5.00E+02 PASS 4.90E+03 7.27E+02 6.89E+03 2.91E+03 5.00E+02 PASS 4.90E+03 7.27E+02 6.89E+03 2.91E+03 5.00E+02 PASS An ISO 9001:2000 Certified Company 112 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E+03 5.00E+03 4.00E+03 3.00E+03 2.00E+03 1.00E+03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.53. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 113 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.53. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 6.36E+03 4.87E+03 3.60E+03 4.12E+03 5.89E+03 6.56E+03 4.79E+03 4.38E+03 3.71E+03 3.68E+03 3.50E+03 10 6.47E+03 4.49E+03 3.42E+03 3.77E+03 5.43E+03 6.42E+03 5.26E+03 4.35E+03 3.62E+03 3.82E+03 3.63E+03 20 6.32E+03 4.63E+03 3.16E+03 3.72E+03 5.24E+03 6.35E+03 4.80E+03 4.28E+03 3.43E+03 3.71E+03 3.54E+03 30 5.70E+03 4.68E+03 3.31E+03 3.59E+03 4.96E+03 6.15E+03 5.12E+03 3.91E+03 3.74E+03 3.47E+03 3.75E+03 50 6.20E+03 4.15E+03 3.35E+03 3.46E+03 4.97E+03 6.64E+03 4.36E+03 4.00E+03 3.57E+03 3.54E+03 3.54E+03 60 5.67E+03 4.44E+03 3.08E+03 3.53E+03 4.97E+03 6.00E+03 4.64E+03 4.05E+03 3.27E+03 3.53E+03 3.58E+03 70 5.67E+03 4.44E+03 3.08E+03 3.53E+03 4.97E+03 6.00E+03 4.64E+03 4.05E+03 3.27E+03 3.53E+03 3.58E+03 4.97E+03 1.16E+03 8.15E+03 1.78E+03 4.72E+03 1.25E+03 8.13E+03 1.30E+03 4.61E+03 1.25E+03 8.03E+03 1.20E+03 4.45E+03 9.90E+02 7.16E+03 1.73E+03 4.43E+03 1.18E+03 7.67E+03 1.18E+03 4.34E+03 1.05E+03 7.22E+03 1.45E+03 4.34E+03 1.05E+03 7.22E+03 1.45E+03 4.62E+03 1.18E+03 7.86E+03 1.39E+03 1.00E+03 PASS 4.69E+03 1.16E+03 7.86E+03 1.53E+03 5.00E+02 PASS 4.51E+03 1.16E+03 7.68E+03 1.34E+03 5.00E+02 PASS 4.48E+03 1.13E+03 7.57E+03 1.38E+03 5.00E+02 PASS 4.42E+03 1.29E+03 7.95E+03 8.98E+02 5.00E+02 PASS 4.30E+03 1.09E+03 7.28E+03 1.32E+03 5.00E+02 PASS 4.30E+03 1.09E+03 7.28E+03 1.32E+03 5.00E+02 PASS An ISO 9001:2000 Certified Company 114 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 5.00E+03 4.50E+03 4.00E+03 3.50E+03 3.00E+03 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.54. Plot of Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 115 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.54. Raw data for Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.31E+03 3.75E+03 6.16E+03 5.58E+03 4.01E+03 3.90E+03 4.36E+03 4.65E+03 3.85E+03 3.79E+03 6.23E+03 10 4.36E+03 3.62E+03 5.94E+03 4.93E+03 3.84E+03 3.83E+03 4.10E+03 4.34E+03 3.62E+03 3.60E+03 5.84E+03 20 4.18E+03 3.48E+03 5.70E+03 5.15E+03 4.04E+03 3.79E+03 4.01E+03 4.47E+03 3.88E+03 3.80E+03 6.18E+03 30 4.37E+03 3.44E+03 6.10E+03 4.90E+03 3.82E+03 3.67E+03 3.96E+03 4.22E+03 3.90E+03 3.64E+03 5.97E+03 50 3.93E+03 3.61E+03 5.65E+03 4.91E+03 3.80E+03 3.73E+03 3.89E+03 4.23E+03 3.51E+03 3.49E+03 5.64E+03 60 4.04E+03 3.28E+03 5.65E+03 4.91E+03 3.73E+03 3.59E+03 4.18E+03 4.33E+03 3.81E+03 3.53E+03 6.07E+03 70 4.04E+03 3.28E+03 5.65E+03 4.91E+03 3.73E+03 3.59E+03 4.18E+03 4.33E+03 3.81E+03 3.53E+03 6.07E+03 4.76E+03 1.05E+03 7.65E+03 1.87E+03 4.54E+03 9.32E+02 7.10E+03 1.99E+03 4.51E+03 8.96E+02 6.96E+03 2.05E+03 4.52E+03 1.04E+03 7.37E+03 1.67E+03 4.38E+03 8.69E+02 6.76E+03 1.99E+03 4.32E+03 9.51E+02 6.93E+03 1.71E+03 4.32E+03 9.51E+02 6.93E+03 1.71E+03 4.11E+03 3.78E+02 5.15E+03 3.07E+03 1.00E+03 PASS 3.90E+03 3.19E+02 4.77E+03 3.02E+03 5.00E+02 PASS 3.99E+03 2.83E+02 4.77E+03 3.21E+03 5.00E+02 PASS 3.88E+03 2.34E+02 4.52E+03 3.24E+03 5.00E+02 PASS 3.77E+03 3.04E+02 4.60E+03 2.94E+03 5.00E+02 PASS 3.89E+03 3.55E+02 4.86E+03 2.91E+03 5.00E+02 PASS 3.89E+03 3.55E+02 4.86E+03 2.91E+03 5.00E+02 PASS An ISO 9001:2000 Certified Company 116 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 -5.00E+02 -1.00E+03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.55. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 117 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.55. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.86E+02 9.44E+02 2.38E+03 8.76E+02 2.25E+03 2.12E+03 9.04E+02 2.18E+03 9.29E+02 2.14E+03 2.15E+03 10 8.73E+02 9.05E+02 2.20E+03 8.73E+02 2.10E+03 2.03E+03 9.01E+02 2.09E+03 9.12E+02 2.04E+03 2.09E+03 20 8.65E+02 8.92E+02 2.17E+03 8.68E+02 2.09E+03 1.99E+03 8.90E+02 2.06E+03 9.00E+02 2.03E+03 2.13E+03 30 8.48E+02 8.80E+02 2.19E+03 8.22E+02 2.03E+03 1.99E+03 8.93E+02 2.01E+03 8.88E+02 1.97E+03 2.11E+03 50 8.57E+02 8.80E+02 2.13E+03 8.49E+02 1.97E+03 1.95E+03 8.64E+02 1.93E+03 8.74E+02 1.86E+03 2.08E+03 60 8.41E+02 8.50E+02 2.11E+03 8.41E+02 1.94E+03 1.95E+03 8.62E+02 1.93E+03 8.90E+02 1.90E+03 2.14E+03 70 8.41E+02 8.50E+02 2.11E+03 8.41E+02 1.94E+03 1.95E+03 8.62E+02 1.93E+03 8.90E+02 1.90E+03 2.14E+03 1.47E+03 7.74E+02 3.59E+03 -6.57E+02 1.39E+03 6.94E+02 3.29E+03 -5.14E+02 1.38E+03 6.85E+02 3.25E+03 -5.04E+02 1.35E+03 6.92E+02 3.25E+03 -5.45E+02 1.34E+03 6.51E+02 3.12E+03 -4.50E+02 1.32E+03 6.48E+02 3.09E+03 -4.62E+02 1.32E+03 6.48E+02 3.09E+03 -4.62E+02 1.65E+03 6.73E+02 3.50E+03 -1.93E+02 5.00E+02 FAIL 1.60E+03 6.30E+02 3.32E+03 -1.32E+02 2.50E+02 FAIL 1.57E+03 6.20E+02 3.27E+03 -1.27E+02 2.50E+02 FAIL 1.55E+03 6.03E+02 3.20E+03 -1.02E+02 2.50E+02 FAIL 1.50E+03 5.74E+02 3.07E+03 -7.72E+01 2.50E+02 FAIL 1.50E+03 5.74E+02 3.08E+03 -7.00E+01 2.50E+02 FAIL 1.50E+03 5.74E+02 3.08E+03 -7.00E+01 2.50E+02 FAIL An ISO 9001:2000 Certified Company 118 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.56. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 119 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.56. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.07E+02 9.76E+02 9.27E+02 1.17E+03 9.35E+02 1.14E+03 2.00E+03 2.12E+03 2.05E+03 1.05E+03 2.25E+03 10 8.94E+02 9.25E+02 8.94E+02 1.11E+03 8.77E+02 1.12E+03 1.92E+03 2.03E+03 1.94E+03 1.03E+03 2.10E+03 20 8.88E+02 9.35E+02 8.85E+02 1.14E+03 8.79E+02 1.14E+03 1.91E+03 1.96E+03 1.88E+03 1.03E+03 2.18E+03 30 8.34E+02 9.11E+02 8.76E+02 1.11E+03 8.74E+02 1.09E+03 1.89E+03 1.94E+03 1.87E+03 1.04E+03 1.93E+03 50 8.34E+02 9.04E+02 8.74E+02 1.07E+03 8.79E+02 1.09E+03 1.74E+03 1.87E+03 1.85E+03 9.77E+02 2.24E+03 60 8.51E+02 8.84E+02 8.53E+02 1.08E+03 8.06E+02 1.09E+03 1.77E+03 1.91E+03 1.84E+03 1.06E+03 2.11E+03 70 8.51E+02 8.84E+02 8.53E+02 1.08E+03 8.06E+02 1.09E+03 1.77E+03 1.91E+03 1.84E+03 1.06E+03 2.11E+03 9.84E+02 1.09E+02 1.28E+03 6.85E+02 9.39E+02 9.53E+01 1.20E+03 6.78E+02 9.45E+02 1.10E+02 1.25E+03 6.43E+02 9.22E+02 1.10E+02 1.22E+03 6.19E+02 9.13E+02 9.34E+01 1.17E+03 6.57E+02 8.95E+02 1.08E+02 1.19E+03 5.98E+02 8.95E+02 1.08E+02 1.19E+03 5.98E+02 1.67E+03 5.31E+02 3.13E+03 2.13E+02 5.00E+02 FAIL 1.61E+03 4.89E+02 2.95E+03 2.67E+02 2.50E+02 PASS 1.58E+03 4.59E+02 2.84E+03 3.23E+02 2.50E+02 PASS 1.57E+03 4.60E+02 2.83E+03 3.04E+02 2.50E+02 PASS 1.50E+03 4.36E+02 2.70E+03 3.09E+02 2.50E+02 PASS 1.54E+03 4.24E+02 2.70E+03 3.71E+02 2.50E+02 PASS 1.54E+03 4.24E+02 2.70E+03 3.71E+02 2.50E+02 PASS An ISO 9001:2000 Certified Company 120 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 -5.00E+02 -1.00E+03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.57. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 121 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.57. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 2.50E+03 1.40E+03 9.13E+02 1.02E+03 2.21E+03 2.54E+03 1.89E+03 1.08E+03 9.48E+02 9.95E+02 9.39E+02 10 2.41E+03 1.33E+03 8.80E+02 9.73E+02 1.98E+03 2.48E+03 1.75E+03 1.08E+03 9.26E+02 9.78E+02 9.46E+02 20 2.31E+03 1.28E+03 8.73E+02 9.56E+02 1.99E+03 2.49E+03 1.75E+03 1.04E+03 9.25E+02 9.73E+02 9.45E+02 30 2.17E+03 1.28E+03 8.60E+02 9.50E+02 1.93E+03 2.42E+03 1.70E+03 1.06E+03 9.25E+02 9.54E+02 9.48E+02 50 2.17E+03 1.27E+03 8.48E+02 9.31E+02 1.89E+03 2.27E+03 1.57E+03 1.04E+03 9.11E+02 9.58E+02 9.59E+02 60 2.21E+03 1.24E+03 8.47E+02 9.16E+02 1.91E+03 2.30E+03 1.72E+03 1.03E+03 8.92E+02 9.53E+02 9.42E+02 70 2.21E+03 1.24E+03 8.47E+02 9.16E+02 1.91E+03 2.30E+03 1.72E+03 1.03E+03 8.92E+02 9.53E+02 9.42E+02 1.61E+03 7.13E+02 3.56E+03 -3.49E+02 1.52E+03 6.62E+02 3.33E+03 -2.99E+02 1.48E+03 6.37E+02 3.23E+03 -2.65E+02 1.44E+03 5.85E+02 3.04E+03 -1.67E+02 1.42E+03 5.84E+02 3.02E+03 -1.80E+02 1.43E+03 6.08E+02 3.09E+03 -2.42E+02 1.43E+03 6.08E+02 3.09E+03 -2.42E+02 1.49E+03 7.03E+02 3.42E+03 -4.36E+02 5.00E+02 FAIL 1.44E+03 6.68E+02 3.28E+03 -3.89E+02 2.50E+02 FAIL 1.44E+03 6.78E+02 3.30E+03 -4.24E+02 2.50E+02 FAIL 1.41E+03 6.45E+02 3.18E+03 -3.60E+02 2.50E+02 FAIL 1.35E+03 5.77E+02 2.93E+03 -2.32E+02 2.50E+02 FAIL 1.38E+03 6.13E+02 3.06E+03 -3.00E+02 2.50E+02 FAIL 1.38E+03 6.13E+02 3.06E+03 -3.00E+02 2.50E+02 FAIL An ISO 9001:2000 Certified Company 122 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.58. Plot of Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 123 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.58. Raw data for Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.28E+03 9.56E+02 2.24E+03 1.97E+03 1.22E+03 9.99E+02 1.05E+03 1.29E+03 9.61E+02 9.30E+02 2.18E+03 10 1.24E+03 9.13E+02 2.00E+03 1.88E+03 1.18E+03 9.82E+02 1.04E+03 1.30E+03 9.54E+02 9.29E+02 2.14E+03 20 1.23E+03 9.07E+02 2.03E+03 1.76E+03 1.17E+03 9.87E+02 1.05E+03 1.28E+03 9.54E+02 9.21E+02 2.20E+03 30 1.20E+03 8.99E+02 2.04E+03 1.79E+03 1.14E+03 9.57E+02 1.02E+03 1.21E+03 9.46E+02 9.02E+02 2.13E+03 50 1.21E+03 8.72E+02 1.94E+03 1.78E+03 1.13E+03 9.80E+02 1.01E+03 1.21E+03 9.39E+02 8.93E+02 2.13E+03 60 1.17E+03 8.64E+02 1.92E+03 1.79E+03 1.13E+03 9.55E+02 1.00E+03 1.18E+03 9.23E+02 8.82E+02 2.13E+03 70 1.17E+03 8.64E+02 1.92E+03 1.79E+03 1.13E+03 9.55E+02 1.00E+03 1.18E+03 9.23E+02 8.82E+02 2.13E+03 1.53E+03 5.47E+02 3.03E+03 3.35E+01 1.44E+03 4.71E+02 2.74E+03 1.50E+02 1.42E+03 4.61E+02 2.68E+03 1.54E+02 1.41E+03 4.80E+02 2.73E+03 9.69E+01 1.39E+03 4.53E+02 2.63E+03 1.45E+02 1.37E+03 4.56E+02 2.62E+03 1.23E+02 1.37E+03 4.56E+02 2.62E+03 1.23E+02 1.05E+03 1.41E+02 1.43E+03 6.57E+02 5.00E+02 FAIL 1.04E+03 1.51E+02 1.45E+03 6.29E+02 2.50E+02 FAIL 1.04E+03 1.44E+02 1.43E+03 6.43E+02 2.50E+02 FAIL 1.01E+03 1.22E+02 1.34E+03 6.72E+02 2.50E+02 FAIL 1.01E+03 1.24E+02 1.35E+03 6.67E+02 2.50E+02 FAIL 9.89E+02 1.17E+02 1.31E+03 6.67E+02 2.50E+02 FAIL 9.89E+02 1.17E+02 1.31E+03 6.67E+02 2.50E+02 FAIL An ISO 9001:2000 Certified Company 124 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.59. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 125 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.59. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.81E+01 1.16E+02 9.99E+01 1.05E+02 1.17E+02 1.02E+02 1.02E+02 1.12E+02 9.86E+01 1.13E+02 1.13E+02 10 9.84E+01 1.16E+02 9.99E+01 1.05E+02 1.16E+02 1.02E+02 1.02E+02 1.13E+02 9.85E+01 1.14E+02 1.13E+02 20 9.84E+01 1.16E+02 9.99E+01 1.05E+02 1.16E+02 1.02E+02 1.02E+02 1.13E+02 9.85E+01 1.14E+02 1.12E+02 30 9.85E+01 1.16E+02 9.99E+01 1.05E+02 1.16E+02 1.02E+02 1.02E+02 1.13E+02 9.84E+01 1.14E+02 1.13E+02 50 9.86E+01 1.16E+02 9.98E+01 1.05E+02 1.16E+02 1.02E+02 1.02E+02 1.14E+02 9.84E+01 1.15E+02 1.13E+02 60 9.85E+01 1.16E+02 9.98E+01 1.05E+02 1.17E+02 1.02E+02 1.02E+02 1.13E+02 9.84E+01 1.14E+02 1.13E+02 70 9.85E+01 1.16E+02 9.98E+01 1.05E+02 1.17E+02 1.02E+02 1.02E+02 1.13E+02 9.84E+01 1.14E+02 1.13E+02 1.07E+02 8.96E+00 1.32E+02 8.26E+01 1.07E+02 8.51E+00 1.30E+02 8.36E+01 1.07E+02 8.36E+00 1.30E+02 8.40E+01 1.07E+02 8.60E+00 1.31E+02 8.35E+01 1.07E+02 8.54E+00 1.30E+02 8.36E+01 1.07E+02 8.77E+00 1.31E+02 8.32E+01 1.07E+02 8.77E+00 1.31E+02 8.32E+01 1.06E+02 6.54E+00 1.23E+02 8.76E+01 9.00E+01 FAIL 1.06E+02 7.11E+00 1.25E+02 8.64E+01 8.60E+01 FAIL 1.06E+02 7.23E+00 1.26E+02 8.61E+01 8.60E+01 FAIL 1.06E+02 7.32E+00 1.26E+02 8.59E+01 8.60E+01 FAIL 1.06E+02 7.48E+00 1.27E+02 8.55E+01 8.60E+01 FAIL 1.06E+02 7.30E+00 1.26E+02 8.59E+01 8.60E+01 FAIL 1.06E+02 7.30E+00 1.26E+02 8.59E+01 8.60E+01 FAIL An ISO 9001:2000 Certified Company 126 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.60. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 127 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.60. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.19E+02 1.03E+02 1.04E+02 9.98E+01 1.01E+02 1.02E+02 1.03E+02 1.23E+02 1.03E+02 1.04E+02 1.08E+02 10 1.22E+02 1.03E+02 1.04E+02 1.00E+02 1.01E+02 1.02E+02 1.03E+02 1.22E+02 1.03E+02 1.05E+02 1.09E+02 20 1.22E+02 1.03E+02 1.04E+02 1.00E+02 1.01E+02 1.02E+02 1.03E+02 1.21E+02 1.03E+02 1.04E+02 1.08E+02 30 1.22E+02 1.03E+02 1.04E+02 1.00E+02 1.01E+02 1.02E+02 1.03E+02 1.20E+02 1.03E+02 1.04E+02 1.09E+02 50 1.24E+02 1.03E+02 1.04E+02 1.01E+02 1.01E+02 1.02E+02 1.02E+02 1.20E+02 1.03E+02 1.04E+02 1.08E+02 60 1.23E+02 1.03E+02 1.04E+02 1.00E+02 1.01E+02 1.02E+02 1.02E+02 1.21E+02 1.03E+02 1.04E+02 1.08E+02 70 1.23E+02 1.03E+02 1.04E+02 1.00E+02 1.01E+02 1.02E+02 1.02E+02 1.21E+02 1.03E+02 1.04E+02 1.08E+02 1.05E+02 7.72E+00 1.26E+02 8.40E+01 1.06E+02 8.98E+00 1.30E+02 8.12E+01 1.06E+02 8.88E+00 1.30E+02 8.15E+01 1.06E+02 9.11E+00 1.31E+02 8.10E+01 1.06E+02 1.01E+01 1.34E+02 7.87E+01 1.06E+02 9.57E+00 1.32E+02 7.99E+01 1.06E+02 9.57E+00 1.32E+02 7.99E+01 1.07E+02 8.82E+00 1.31E+02 8.30E+01 9.00E+01 FAIL 1.07E+02 8.31E+00 1.30E+02 8.41E+01 8.60E+01 FAIL 1.07E+02 8.02E+00 1.29E+02 8.47E+01 8.60E+01 FAIL 1.07E+02 7.84E+00 1.28E+02 8.50E+01 8.60E+01 FAIL 1.06E+02 7.70E+00 1.27E+02 8.52E+01 8.60E+01 FAIL 1.07E+02 8.03E+00 1.29E+02 8.45E+01 8.60E+01 FAIL 1.07E+02 8.03E+00 1.29E+02 8.45E+01 8.60E+01 FAIL An ISO 9001:2000 Certified Company 128 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.61. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 129 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.61. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.06E+02 9.92E+01 9.79E+01 9.92E+01 1.11E+02 1.05E+02 1.06E+02 9.82E+01 1.05E+02 9.98E+01 9.77E+01 10 1.05E+02 9.94E+01 9.78E+01 9.92E+01 1.11E+02 1.05E+02 1.06E+02 9.82E+01 1.05E+02 9.98E+01 9.78E+01 20 1.05E+02 9.95E+01 9.79E+01 9.92E+01 1.11E+02 1.05E+02 1.06E+02 9.82E+01 1.05E+02 9.98E+01 9.78E+01 30 1.05E+02 9.95E+01 9.79E+01 9.92E+01 1.10E+02 1.04E+02 1.05E+02 9.82E+01 1.05E+02 9.98E+01 9.78E+01 50 1.05E+02 9.96E+01 9.82E+01 9.92E+01 1.10E+02 1.04E+02 1.05E+02 9.83E+01 1.05E+02 9.98E+01 9.77E+01 60 1.05E+02 9.96E+01 9.81E+01 9.91E+01 1.10E+02 1.04E+02 1.05E+02 9.82E+01 1.05E+02 9.98E+01 9.78E+01 70 1.05E+02 9.96E+01 9.81E+01 9.91E+01 1.10E+02 1.04E+02 1.05E+02 9.82E+01 1.05E+02 9.98E+01 9.78E+01 1.03E+02 5.48E+00 1.18E+02 8.75E+01 1.03E+02 5.41E+00 1.17E+02 8.77E+01 1.02E+02 5.32E+00 1.17E+02 8.79E+01 1.02E+02 5.23E+00 1.17E+02 8.81E+01 1.02E+02 4.99E+00 1.16E+02 8.87E+01 1.02E+02 5.20E+00 1.17E+02 8.82E+01 1.02E+02 5.20E+00 1.17E+02 8.82E+01 1.03E+02 3.58E+00 1.13E+02 9.31E+01 9.00E+01 FAIL 1.03E+02 3.44E+00 1.12E+02 9.33E+01 8.60E+01 PASS 1.03E+02 3.38E+00 1.12E+02 9.34E+01 8.60E+01 PASS 1.03E+02 3.34E+00 1.12E+02 9.34E+01 8.60E+01 PASS 1.03E+02 3.29E+00 1.12E+02 9.35E+01 8.60E+01 PASS 1.03E+02 3.33E+00 1.12E+02 9.34E+01 8.60E+01 PASS 1.03E+02 3.33E+00 1.12E+02 9.34E+01 8.60E+01 PASS An ISO 9001:2000 Certified Company 130 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.62. Plot of Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 131 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.62. Raw data for Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.16E+02 1.08E+02 1.03E+02 1.05E+02 1.36E+02 1.03E+02 1.03E+02 9.77E+01 9.92E+01 1.06E+02 1.08E+02 10 1.14E+02 1.08E+02 1.03E+02 1.05E+02 1.30E+02 1.03E+02 1.03E+02 9.75E+01 9.92E+01 1.06E+02 1.08E+02 20 1.13E+02 1.08E+02 1.03E+02 1.05E+02 1.29E+02 1.03E+02 1.03E+02 9.74E+01 9.92E+01 1.06E+02 1.08E+02 30 1.13E+02 1.08E+02 1.03E+02 1.04E+02 1.29E+02 1.03E+02 1.03E+02 9.74E+01 9.91E+01 1.06E+02 1.08E+02 50 1.12E+02 1.08E+02 1.03E+02 1.04E+02 1.26E+02 1.03E+02 1.03E+02 9.73E+01 9.90E+01 1.06E+02 1.08E+02 60 1.13E+02 1.08E+02 1.03E+02 1.04E+02 1.28E+02 1.03E+02 1.03E+02 9.73E+01 9.90E+01 1.06E+02 1.08E+02 70 1.13E+02 1.08E+02 1.03E+02 1.04E+02 1.28E+02 1.03E+02 1.03E+02 9.73E+01 9.90E+01 1.06E+02 1.08E+02 1.13E+02 1.36E+01 1.51E+02 7.62E+01 1.12E+02 1.08E+01 1.41E+02 8.20E+01 1.11E+02 1.05E+01 1.40E+02 8.25E+01 1.11E+02 1.06E+01 1.41E+02 8.23E+01 1.11E+02 9.22E+00 1.36E+02 8.53E+01 1.11E+02 1.01E+01 1.39E+02 8.34E+01 1.11E+02 1.01E+01 1.39E+02 8.34E+01 1.02E+02 3.45E+00 1.11E+02 9.24E+01 9.00E+01 FAIL 1.02E+02 3.41E+00 1.11E+02 9.24E+01 8.60E+01 FAIL 1.02E+02 3.40E+00 1.11E+02 9.24E+01 8.60E+01 FAIL 1.02E+02 3.41E+00 1.11E+02 9.24E+01 8.60E+01 FAIL 1.02E+02 3.44E+00 1.11E+02 9.22E+01 8.60E+01 FAIL 1.02E+02 3.42E+00 1.11E+02 9.22E+01 8.60E+01 FAIL 1.02E+02 3.42E+00 1.11E+02 9.22E+01 8.60E+01 FAIL An ISO 9001:2000 Certified Company 132 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.63. Plot of Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 133 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.63. Raw data for Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 168 hr Anneal 0 9.93E+01 1.12E+02 1.11E+02 1.39E+02 1.18E+02 1.21E+02 1.21E+02 9.61E+01 1.22E+02 1.03E+02 1.17E+02 10 1.00E+02 1.12E+02 1.11E+02 1.39E+02 1.18E+02 1.21E+02 1.20E+02 9.62E+01 1.21E+02 1.03E+02 1.16E+02 20 1.00E+02 1.12E+02 1.11E+02 1.38E+02 1.18E+02 1.21E+02 1.20E+02 9.61E+01 1.21E+02 1.03E+02 1.16E+02 30 1.00E+02 1.12E+02 1.11E+02 1.32E+02 1.19E+02 1.21E+02 1.20E+02 9.61E+01 1.21E+02 1.03E+02 1.16E+02 50 1.01E+02 1.12E+02 1.10E+02 1.31E+02 1.20E+02 1.20E+02 1.19E+02 9.61E+01 1.21E+02 1.03E+02 1.16E+02 60 1.00E+02 1.12E+02 1.10E+02 1.29E+02 1.20E+02 1.21E+02 1.20E+02 9.60E+01 1.21E+02 1.03E+02 1.16E+02 70 1.00E+02 1.12E+02 1.10E+02 1.29E+02 1.20E+02 1.21E+02 1.20E+02 9.60E+01 1.21E+02 1.03E+02 1.16E+02 1.16E+02 1.47E+01 1.56E+02 7.55E+01 1.16E+02 1.43E+01 1.55E+02 7.68E+01 1.16E+02 1.40E+01 1.54E+02 7.74E+01 1.15E+02 1.18E+01 1.47E+02 8.24E+01 1.15E+02 1.14E+01 1.46E+02 8.34E+01 1.14E+02 1.08E+01 1.44E+02 8.46E+01 1.14E+02 1.08E+01 1.44E+02 8.46E+01 1.13E+02 1.23E+01 1.47E+02 7.91E+01 8.40E+01 FAIL 1.12E+02 1.19E+01 1.45E+02 7.98E+01 8.30E+01 FAIL 1.12E+02 1.18E+01 1.45E+02 7.99E+01 8.30E+01 FAIL 1.12E+02 1.17E+01 1.44E+02 8.01E+01 8.30E+01 FAIL 1.12E+02 1.14E+01 1.43E+02 8.04E+01 8.30E+01 FAIL 1.12E+02 1.18E+01 1.45E+02 7.98E+01 8.30E+01 FAIL 1.12E+02 1.18E+01 1.45E+02 7.98E+01 8.30E+01 FAIL An ISO 9001:2000 Certified Company 134 24 hr Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.64. Plot of Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 135 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.64. Raw data for Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 168 hr Anneal 0 1.04E+02 1.08E+02 1.04E+02 1.24E+02 1.04E+02 1.14E+02 1.13E+02 9.87E+01 1.16E+02 1.07E+02 1.01E+02 10 1.04E+02 1.09E+02 1.04E+02 1.19E+02 1.04E+02 1.14E+02 1.14E+02 9.88E+01 1.18E+02 1.07E+02 1.01E+02 20 1.04E+02 1.09E+02 1.04E+02 1.18E+02 1.04E+02 1.14E+02 1.14E+02 9.89E+01 1.17E+02 1.07E+02 1.01E+02 30 1.04E+02 1.09E+02 1.04E+02 1.17E+02 1.04E+02 1.14E+02 1.14E+02 9.89E+01 1.17E+02 1.08E+02 1.01E+02 50 1.04E+02 1.10E+02 1.05E+02 1.16E+02 1.04E+02 1.15E+02 1.13E+02 9.90E+01 1.17E+02 1.08E+02 1.01E+02 60 1.04E+02 1.10E+02 1.04E+02 1.16E+02 1.04E+02 1.15E+02 1.13E+02 9.88E+01 1.17E+02 1.08E+02 1.01E+02 70 1.04E+02 1.10E+02 1.04E+02 1.16E+02 1.04E+02 1.15E+02 1.13E+02 9.88E+01 1.17E+02 1.08E+02 1.01E+02 1.09E+02 8.46E+00 1.32E+02 8.56E+01 1.08E+02 6.47E+00 1.26E+02 9.03E+01 1.08E+02 5.97E+00 1.24E+02 9.15E+01 1.08E+02 5.61E+00 1.23E+02 9.24E+01 1.08E+02 5.22E+00 1.22E+02 9.35E+01 1.08E+02 5.14E+00 1.22E+02 9.36E+01 1.08E+02 5.14E+00 1.22E+02 9.36E+01 1.10E+02 7.07E+00 1.29E+02 9.06E+01 8.40E+01 PASS 1.10E+02 7.35E+00 1.30E+02 9.00E+01 8.30E+01 PASS 1.10E+02 7.32E+00 1.30E+02 9.02E+01 8.30E+01 PASS 1.10E+02 7.32E+00 1.30E+02 9.03E+01 8.30E+01 PASS 1.10E+02 7.11E+00 1.30E+02 9.08E+01 8.30E+01 PASS 1.10E+02 7.21E+00 1.30E+02 9.05E+01 8.30E+01 PASS 1.10E+02 7.21E+00 1.30E+02 9.05E+01 8.30E+01 PASS An ISO 9001:2000 Certified Company 136 24 hr Anneal Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.65. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 137 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.65. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.07E+02 1.03E+02 1.03E+02 1.54E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.24E+02 1.12E+02 10 1.07E+02 1.03E+02 1.03E+02 1.43E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.24E+02 1.12E+02 20 1.07E+02 1.03E+02 1.03E+02 1.41E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.24E+02 1.12E+02 30 1.07E+02 1.03E+02 1.03E+02 1.39E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.24E+02 1.12E+02 50 1.07E+02 1.03E+02 1.03E+02 1.36E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.24E+02 1.12E+02 60 1.07E+02 1.03E+02 1.03E+02 1.38E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.23E+02 1.12E+02 70 1.07E+02 1.03E+02 1.03E+02 1.38E+02 1.10E+02 1.13E+02 1.12E+02 1.13E+02 1.09E+02 1.23E+02 1.12E+02 1.15E+02 2.20E+01 1.76E+02 5.50E+01 1.13E+02 1.69E+01 1.59E+02 6.67E+01 1.13E+02 1.60E+01 1.57E+02 6.88E+01 1.12E+02 1.54E+01 1.54E+02 7.02E+01 1.12E+02 1.41E+01 1.50E+02 7.32E+01 1.12E+02 1.51E+01 1.53E+02 7.08E+01 1.12E+02 1.51E+01 1.53E+02 7.08E+01 1.14E+02 5.61E+00 1.30E+02 9.87E+01 9.00E+01 FAIL 1.14E+02 5.50E+00 1.29E+02 9.90E+01 9.00E+01 FAIL 1.14E+02 5.56E+00 1.29E+02 9.89E+01 9.00E+01 FAIL 1.14E+02 5.57E+00 1.29E+02 9.88E+01 9.00E+01 FAIL 1.14E+02 5.48E+00 1.29E+02 9.91E+01 9.00E+01 FAIL 1.14E+02 5.40E+00 1.29E+02 9.92E+01 9.00E+01 FAIL 1.14E+02 5.40E+00 1.29E+02 9.92E+01 9.00E+01 FAIL An ISO 9001:2000 Certified Company 138 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.66. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 139 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.66. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.15E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.83E+01 1.25E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 10 1.15E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.82E+01 1.25E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 20 1.16E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.82E+01 1.24E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 30 1.16E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.82E+01 1.25E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 50 1.16E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.82E+01 1.24E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 60 1.16E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.82E+01 1.24E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 70 1.16E+02 1.14E+02 1.21E+02 1.04E+02 1.06E+02 9.82E+01 1.24E+02 1.10E+02 1.05E+02 1.06E+02 1.05E+02 1.12E+02 6.84E+00 1.31E+02 9.33E+01 1.12E+02 6.95E+00 1.31E+02 9.30E+01 1.12E+02 6.93E+00 1.31E+02 9.31E+01 1.12E+02 6.93E+00 1.31E+02 9.30E+01 1.12E+02 7.12E+00 1.32E+02 9.27E+01 1.12E+02 7.01E+00 1.31E+02 9.28E+01 1.12E+02 7.01E+00 1.31E+02 9.28E+01 1.09E+02 9.75E+00 1.36E+02 8.21E+01 9.00E+01 FAIL 1.09E+02 9.75E+00 1.36E+02 8.21E+01 9.00E+01 FAIL 1.09E+02 9.69E+00 1.35E+02 8.23E+01 9.00E+01 FAIL 1.09E+02 9.83E+00 1.36E+02 8.19E+01 9.00E+01 FAIL 1.09E+02 9.52E+00 1.35E+02 8.27E+01 9.00E+01 FAIL 1.09E+02 9.39E+00 1.34E+02 8.29E+01 9.00E+01 FAIL 1.09E+02 9.39E+00 1.34E+02 8.29E+01 9.00E+01 FAIL An ISO 9001:2000 Certified Company 140 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.67. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 141 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.67. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.02E+02 1.05E+02 1.03E+02 1.05E+02 1.05E+02 1.03E+02 1.11E+02 1.06E+02 1.25E+02 1.22E+02 1.09E+02 10 1.02E+02 1.05E+02 1.03E+02 1.04E+02 1.05E+02 1.03E+02 1.11E+02 1.06E+02 1.25E+02 1.22E+02 1.09E+02 20 1.02E+02 1.05E+02 1.03E+02 1.04E+02 1.05E+02 1.03E+02 1.10E+02 1.06E+02 1.25E+02 1.22E+02 1.09E+02 30 1.02E+02 1.05E+02 1.03E+02 1.04E+02 1.05E+02 1.03E+02 1.10E+02 1.05E+02 1.25E+02 1.22E+02 1.09E+02 50 1.02E+02 1.05E+02 1.03E+02 1.04E+02 1.05E+02 1.03E+02 1.10E+02 1.05E+02 1.26E+02 1.22E+02 1.09E+02 60 1.02E+02 1.05E+02 1.03E+02 1.04E+02 1.05E+02 1.03E+02 1.10E+02 1.05E+02 1.25E+02 1.22E+02 1.09E+02 70 1.02E+02 1.05E+02 1.03E+02 1.04E+02 1.05E+02 1.03E+02 1.10E+02 1.05E+02 1.25E+02 1.22E+02 1.09E+02 1.04E+02 1.40E+00 1.08E+02 1.00E+02 1.04E+02 1.31E+00 1.07E+02 1.00E+02 1.04E+02 1.27E+00 1.07E+02 1.00E+02 1.04E+02 1.27E+00 1.07E+02 1.00E+02 1.04E+02 1.24E+00 1.07E+02 1.01E+02 1.04E+02 1.27E+00 1.07E+02 1.00E+02 1.04E+02 1.27E+00 1.07E+02 1.00E+02 1.13E+02 9.97E+00 1.41E+02 8.60E+01 9.00E+01 FAIL 1.13E+02 9.88E+00 1.40E+02 8.60E+01 9.00E+01 FAIL 1.13E+02 1.00E+01 1.41E+02 8.57E+01 9.00E+01 FAIL 1.13E+02 9.92E+00 1.40E+02 8.59E+01 9.00E+01 FAIL 1.13E+02 1.01E+01 1.41E+02 8.56E+01 9.00E+01 FAIL 1.13E+02 9.93E+00 1.40E+02 8.59E+01 9.00E+01 FAIL 1.13E+02 9.93E+00 1.40E+02 8.59E+01 9.00E+01 FAIL An ISO 9001:2000 Certified Company 142 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.30E+02 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.68. Plot of Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 143 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.68. Raw data for Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.31E+02 1.08E+02 1.04E+02 1.10E+02 1.57E+02 1.05E+02 1.04E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 10 1.31E+02 1.08E+02 1.04E+02 1.09E+02 1.46E+02 1.05E+02 1.04E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 20 1.31E+02 1.08E+02 1.04E+02 1.09E+02 1.49E+02 1.05E+02 1.04E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 30 1.31E+02 1.08E+02 1.04E+02 1.10E+02 1.49E+02 1.05E+02 1.04E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 50 1.32E+02 1.08E+02 1.04E+02 1.10E+02 1.49E+02 1.05E+02 1.03E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 60 1.31E+02 1.08E+02 1.04E+02 1.09E+02 1.53E+02 1.05E+02 1.03E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 70 1.31E+02 1.08E+02 1.04E+02 1.09E+02 1.53E+02 1.05E+02 1.03E+02 1.02E+02 1.07E+02 1.02E+02 1.06E+02 1.22E+02 2.21E+01 1.83E+02 6.14E+01 1.20E+02 1.78E+01 1.69E+02 7.08E+01 1.20E+02 1.91E+01 1.73E+02 6.81E+01 1.20E+02 1.90E+01 1.72E+02 6.83E+01 1.21E+02 1.91E+01 1.73E+02 6.82E+01 1.21E+02 2.06E+01 1.78E+02 6.47E+01 1.21E+02 2.06E+01 1.78E+02 6.47E+01 1.04E+02 2.12E+00 1.10E+02 9.83E+01 9.00E+01 FAIL 1.04E+02 2.13E+00 1.10E+02 9.83E+01 9.00E+01 FAIL 1.04E+02 2.14E+00 1.10E+02 9.82E+01 9.00E+01 FAIL 1.04E+02 2.15E+00 1.10E+02 9.82E+01 9.00E+01 FAIL 1.04E+02 2.15E+00 1.10E+02 9.82E+01 9.00E+01 FAIL 1.04E+02 2.16E+00 1.10E+02 9.81E+01 9.00E+01 FAIL 1.04E+02 2.16E+00 1.10E+02 9.81E+01 9.00E+01 FAIL An ISO 9001:2000 Certified Company 144 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.69. Plot of Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 145 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.69. Raw data for Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.06E+02 1.09E+02 1.18E+02 1.10E+02 1.10E+02 1.10E+02 1.01E+02 1.06E+02 1.21E+02 1.01E+02 1.13E+02 10 1.07E+02 1.09E+02 1.19E+02 1.09E+02 1.10E+02 1.10E+02 1.01E+02 1.06E+02 1.21E+02 1.01E+02 1.13E+02 20 1.07E+02 1.09E+02 1.19E+02 1.09E+02 1.10E+02 1.10E+02 1.01E+02 1.06E+02 1.21E+02 1.01E+02 1.13E+02 30 1.07E+02 1.09E+02 1.19E+02 1.09E+02 1.10E+02 1.10E+02 1.01E+02 1.06E+02 1.21E+02 1.01E+02 1.13E+02 50 1.07E+02 1.09E+02 1.19E+02 1.09E+02 1.10E+02 1.10E+02 1.01E+02 1.06E+02 1.20E+02 1.01E+02 1.13E+02 60 1.06E+02 1.09E+02 1.19E+02 1.09E+02 1.10E+02 1.10E+02 1.01E+02 1.05E+02 1.21E+02 1.01E+02 1.13E+02 70 1.06E+02 1.09E+02 1.19E+02 1.09E+02 1.10E+02 1.10E+02 1.01E+02 1.05E+02 1.21E+02 1.01E+02 1.13E+02 1.11E+02 4.45E+00 1.23E+02 9.85E+01 1.11E+02 4.57E+00 1.23E+02 9.82E+01 1.11E+02 4.78E+00 1.24E+02 9.77E+01 1.11E+02 4.59E+00 1.23E+02 9.81E+01 1.11E+02 4.67E+00 1.24E+02 9.81E+01 1.11E+02 4.64E+00 1.23E+02 9.79E+01 1.11E+02 4.64E+00 1.23E+02 9.79E+01 1.08E+02 8.27E+00 1.31E+02 8.52E+01 8.30E+01 PASS 1.08E+02 8.24E+00 1.30E+02 8.52E+01 8.30E+01 PASS 1.08E+02 8.24E+00 1.30E+02 8.51E+01 8.30E+01 PASS 1.08E+02 8.15E+00 1.30E+02 8.54E+01 8.30E+01 PASS 1.08E+02 8.10E+00 1.30E+02 8.54E+01 8.30E+01 PASS 1.08E+02 8.20E+00 1.30E+02 8.52E+01 8.30E+01 PASS 1.08E+02 8.20E+00 1.30E+02 8.52E+01 8.30E+01 PASS An ISO 9001:2000 Certified Company 146 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.70. Plot of Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 147 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.70. Raw data for Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.04E+02 1.08E+02 1.05E+02 1.41E+02 1.25E+02 1.06E+02 1.13E+02 1.14E+02 1.06E+02 1.05E+02 1.01E+02 10 1.04E+02 1.08E+02 1.04E+02 1.32E+02 1.24E+02 1.06E+02 1.12E+02 1.14E+02 1.06E+02 1.05E+02 1.01E+02 20 1.04E+02 1.08E+02 1.05E+02 1.30E+02 1.24E+02 1.06E+02 1.12E+02 1.13E+02 1.06E+02 1.05E+02 1.00E+02 30 1.04E+02 1.08E+02 1.04E+02 1.29E+02 1.24E+02 1.06E+02 1.12E+02 1.13E+02 1.06E+02 1.05E+02 1.01E+02 50 1.04E+02 1.08E+02 1.05E+02 1.24E+02 1.23E+02 1.06E+02 1.12E+02 1.13E+02 1.06E+02 1.05E+02 1.01E+02 60 1.04E+02 1.08E+02 1.04E+02 1.28E+02 1.24E+02 1.06E+02 1.12E+02 1.13E+02 1.06E+02 1.05E+02 1.01E+02 70 1.04E+02 1.08E+02 1.04E+02 1.28E+02 1.24E+02 1.06E+02 1.12E+02 1.13E+02 1.06E+02 1.05E+02 1.01E+02 1.16E+02 1.59E+01 1.60E+02 7.29E+01 1.15E+02 1.29E+01 1.50E+02 7.93E+01 1.14E+02 1.18E+01 1.47E+02 8.16E+01 1.14E+02 1.15E+01 1.45E+02 8.22E+01 1.13E+02 1.01E+01 1.41E+02 8.52E+01 1.14E+02 1.15E+01 1.45E+02 8.22E+01 1.14E+02 1.15E+01 1.45E+02 8.22E+01 1.09E+02 4.25E+00 1.20E+02 9.71E+01 8.30E+01 FAIL 1.09E+02 4.04E+00 1.20E+02 9.75E+01 8.30E+01 FAIL 1.09E+02 3.91E+00 1.19E+02 9.79E+01 8.30E+01 FAIL 1.08E+02 3.94E+00 1.19E+02 9.77E+01 8.30E+01 FAIL 1.08E+02 3.90E+00 1.19E+02 9.78E+01 8.30E+01 PASS 1.09E+02 3.97E+00 1.19E+02 9.76E+01 8.30E+01 FAIL 1.09E+02 3.97E+00 1.19E+02 9.76E+01 8.30E+01 FAIL An ISO 9001:2000 Certified Company 148 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.71. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 149 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.71. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.91E-03 5.47E-03 5.74E-03 5.46E-03 5.57E-03 5.51E-03 5.49E-03 5.49E-03 5.17E-03 5.73E-03 5.71E-03 10 5.73E-03 5.53E-03 5.70E-03 5.58E-03 5.38E-03 5.55E-03 5.47E-03 5.62E-03 5.26E-03 5.60E-03 5.45E-03 20 5.92E-03 5.73E-03 5.76E-03 5.60E-03 5.56E-03 5.71E-03 5.70E-03 5.53E-03 5.51E-03 5.65E-03 5.75E-03 30 6.00E-03 5.65E-03 5.77E-03 5.58E-03 5.72E-03 5.73E-03 5.72E-03 5.60E-03 5.50E-03 5.70E-03 5.63E-03 50 6.05E-03 5.86E-03 5.76E-03 5.64E-03 5.78E-03 5.76E-03 5.80E-03 5.71E-03 5.59E-03 5.69E-03 5.68E-03 60 6.03E-03 5.83E-03 6.03E-03 5.67E-03 5.84E-03 5.79E-03 5.84E-03 5.67E-03 5.57E-03 5.73E-03 5.79E-03 70 6.03E-03 5.83E-03 6.03E-03 5.67E-03 5.84E-03 5.79E-03 5.84E-03 5.67E-03 5.57E-03 5.73E-03 5.79E-03 5.63E-03 1.93E-04 6.16E-03 5.10E-03 5.58E-03 1.41E-04 5.97E-03 5.20E-03 5.71E-03 1.43E-04 6.11E-03 5.32E-03 5.74E-03 1.60E-04 6.18E-03 5.31E-03 5.82E-03 1.52E-04 6.23E-03 5.40E-03 5.88E-03 1.53E-04 6.30E-03 5.46E-03 5.88E-03 1.53E-04 6.30E-03 5.46E-03 5.48E-03 2.00E-04 6.03E-03 4.93E-03 1.00E-02 PASS 5.50E-03 1.46E-04 5.90E-03 5.10E-03 2.00E-02 PASS 5.62E-03 9.43E-05 5.88E-03 5.36E-03 2.00E-02 PASS 5.65E-03 9.85E-05 5.92E-03 5.38E-03 2.00E-02 PASS 5.71E-03 7.97E-05 5.93E-03 5.49E-03 2.00E-02 PASS 5.72E-03 1.05E-04 6.01E-03 5.43E-03 2.00E-02 PASS 5.72E-03 1.05E-04 6.01E-03 5.43E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 150 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.72. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 151 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.72. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.57E-03 5.86E-03 5.39E-03 5.67E-03 5.56E-03 5.59E-03 5.52E-03 5.69E-03 5.49E-03 5.56E-03 5.46E-03 10 5.65E-03 5.94E-03 5.45E-03 5.58E-03 5.52E-03 5.70E-03 5.62E-03 5.62E-03 5.43E-03 5.62E-03 5.30E-03 20 5.58E-03 6.00E-03 5.46E-03 5.87E-03 5.53E-03 5.55E-03 5.68E-03 5.65E-03 5.55E-03 5.61E-03 5.65E-03 30 5.87E-03 6.00E-03 5.51E-03 5.83E-03 5.55E-03 5.63E-03 5.72E-03 5.58E-03 5.51E-03 5.80E-03 5.48E-03 50 5.81E-03 6.12E-03 5.54E-03 5.93E-03 5.61E-03 5.64E-03 5.86E-03 5.86E-03 5.66E-03 5.78E-03 5.37E-03 60 5.84E-03 6.13E-03 5.67E-03 6.01E-03 5.79E-03 5.84E-03 5.84E-03 5.66E-03 5.64E-03 5.81E-03 5.49E-03 70 5.84E-03 6.13E-03 5.67E-03 6.01E-03 5.79E-03 5.84E-03 5.84E-03 5.66E-03 5.64E-03 5.81E-03 5.49E-03 5.61E-03 1.72E-04 6.08E-03 5.14E-03 5.63E-03 1.89E-04 6.15E-03 5.11E-03 5.69E-03 2.34E-04 6.33E-03 5.05E-03 5.75E-03 2.13E-04 6.34E-03 5.17E-03 5.80E-03 2.36E-04 6.45E-03 5.15E-03 5.89E-03 1.82E-04 6.39E-03 5.39E-03 5.89E-03 1.82E-04 6.39E-03 5.39E-03 5.57E-03 7.71E-05 5.78E-03 5.36E-03 1.00E-02 PASS 5.60E-03 1.00E-04 5.87E-03 5.32E-03 2.00E-02 PASS 5.61E-03 5.85E-05 5.77E-03 5.45E-03 2.00E-02 PASS 5.65E-03 1.14E-04 5.96E-03 5.33E-03 2.00E-02 PASS 5.76E-03 1.06E-04 6.05E-03 5.47E-03 2.00E-02 PASS 5.76E-03 9.96E-05 6.03E-03 5.48E-03 2.00E-02 PASS 5.76E-03 9.96E-05 6.03E-03 5.48E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 152 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.73. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 153 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.73. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.81E-03 5.69E-03 5.35E-03 5.57E-03 5.51E-03 5.51E-03 5.52E-03 5.46E-03 5.35E-03 5.57E-03 5.49E-03 10 5.41E-03 5.62E-03 5.47E-03 5.67E-03 5.43E-03 5.55E-03 5.47E-03 5.50E-03 5.47E-03 5.65E-03 5.48E-03 20 5.71E-03 5.78E-03 5.44E-03 5.75E-03 5.61E-03 5.58E-03 5.60E-03 5.55E-03 5.63E-03 5.70E-03 5.55E-03 30 5.75E-03 5.92E-03 5.55E-03 5.85E-03 5.60E-03 5.63E-03 5.65E-03 5.51E-03 5.51E-03 5.68E-03 5.53E-03 50 5.76E-03 6.01E-03 5.53E-03 5.86E-03 5.66E-03 5.63E-03 5.81E-03 5.59E-03 5.61E-03 5.68E-03 5.51E-03 60 5.79E-03 5.93E-03 5.57E-03 6.00E-03 5.79E-03 5.88E-03 5.66E-03 5.59E-03 5.67E-03 5.78E-03 5.41E-03 70 5.79E-03 5.93E-03 5.57E-03 6.00E-03 5.79E-03 5.88E-03 5.66E-03 5.59E-03 5.67E-03 5.78E-03 5.41E-03 5.59E-03 1.75E-04 6.07E-03 5.11E-03 5.52E-03 1.17E-04 5.84E-03 5.20E-03 5.66E-03 1.38E-04 6.04E-03 5.28E-03 5.73E-03 1.58E-04 6.17E-03 5.30E-03 5.76E-03 1.84E-04 6.27E-03 5.26E-03 5.82E-03 1.65E-04 6.27E-03 5.36E-03 5.82E-03 1.65E-04 6.27E-03 5.36E-03 5.48E-03 8.35E-05 5.71E-03 5.25E-03 1.00E-02 PASS 5.53E-03 7.56E-05 5.74E-03 5.32E-03 2.00E-02 PASS 5.61E-03 5.72E-05 5.77E-03 5.46E-03 2.00E-02 PASS 5.60E-03 8.05E-05 5.82E-03 5.38E-03 2.00E-02 PASS 5.66E-03 8.82E-05 5.91E-03 5.42E-03 2.00E-02 PASS 5.72E-03 1.14E-04 6.03E-03 5.40E-03 2.00E-02 PASS 5.72E-03 1.14E-04 6.03E-03 5.40E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 154 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.74. Plot of Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 155 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.74. Raw data for Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.05E-03 5.51E-03 5.54E-03 5.52E-03 5.49E-03 5.62E-03 5.51E-03 5.49E-03 5.30E-03 5.73E-03 5.66E-03 10 5.95E-03 5.53E-03 5.65E-03 5.65E-03 5.38E-03 5.70E-03 5.50E-03 5.67E-03 5.35E-03 5.60E-03 5.60E-03 20 6.07E-03 5.60E-03 5.49E-03 5.56E-03 5.66E-03 5.70E-03 5.58E-03 5.83E-03 5.49E-03 5.70E-03 5.76E-03 30 6.02E-03 5.68E-03 5.78E-03 5.46E-03 5.73E-03 5.72E-03 5.68E-03 5.77E-03 5.48E-03 5.70E-03 5.77E-03 50 6.27E-03 5.75E-03 5.75E-03 5.73E-03 5.71E-03 5.83E-03 5.66E-03 5.71E-03 5.48E-03 5.86E-03 5.63E-03 60 6.20E-03 5.83E-03 5.64E-03 5.78E-03 5.86E-03 5.76E-03 5.73E-03 5.86E-03 5.57E-03 5.91E-03 5.67E-03 70 6.20E-03 5.83E-03 5.64E-03 5.78E-03 5.86E-03 5.76E-03 5.73E-03 5.86E-03 5.57E-03 5.91E-03 5.67E-03 5.62E-03 2.40E-04 6.28E-03 4.96E-03 5.63E-03 2.10E-04 6.21E-03 5.06E-03 5.68E-03 2.29E-04 6.30E-03 5.05E-03 5.73E-03 2.01E-04 6.29E-03 5.18E-03 5.84E-03 2.40E-04 6.50E-03 5.18E-03 5.86E-03 2.07E-04 6.43E-03 5.29E-03 5.86E-03 2.07E-04 6.43E-03 5.29E-03 5.53E-03 1.60E-04 5.97E-03 5.09E-03 1.00E-02 PASS 5.56E-03 1.42E-04 5.95E-03 5.17E-03 2.00E-02 PASS 5.66E-03 1.30E-04 6.02E-03 5.30E-03 2.00E-02 PASS 5.67E-03 1.11E-04 5.98E-03 5.36E-03 2.00E-02 PASS 5.71E-03 1.52E-04 6.12E-03 5.29E-03 2.00E-02 PASS 5.77E-03 1.32E-04 6.13E-03 5.41E-03 2.00E-02 PASS 5.77E-03 1.32E-04 6.13E-03 5.41E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 156 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.75. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 157 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.75. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.50E-02 7.24E-02 7.30E-02 7.17E-02 7.22E-02 7.38E-02 7.20E-02 7.27E-02 7.17E-02 7.39E-02 7.41E-02 10 7.55E-02 7.38E-02 7.39E-02 7.26E-02 7.31E-02 7.42E-02 7.24E-02 7.30E-02 7.20E-02 7.42E-02 7.38E-02 20 7.60E-02 7.41E-02 7.45E-02 7.33E-02 7.37E-02 7.47E-02 7.29E-02 7.34E-02 7.23E-02 7.47E-02 7.37E-02 30 7.66E-02 7.48E-02 7.51E-02 7.37E-02 7.43E-02 7.49E-02 7.29E-02 7.35E-02 7.27E-02 7.50E-02 7.38E-02 50 7.73E-02 7.49E-02 7.54E-02 7.39E-02 7.47E-02 7.54E-02 7.34E-02 7.40E-02 7.32E-02 7.54E-02 7.40E-02 60 7.81E-02 7.57E-02 7.61E-02 7.47E-02 7.51E-02 7.56E-02 7.37E-02 7.43E-02 7.35E-02 7.55E-02 7.38E-02 70 7.81E-02 7.57E-02 7.61E-02 7.47E-02 7.51E-02 7.56E-02 7.37E-02 7.43E-02 7.35E-02 7.55E-02 7.38E-02 7.28E-02 1.29E-03 7.64E-02 6.93E-02 7.38E-02 1.10E-03 7.68E-02 7.07E-02 7.43E-02 1.06E-03 7.72E-02 7.14E-02 7.49E-02 1.10E-03 7.79E-02 7.19E-02 7.52E-02 1.27E-03 7.87E-02 7.17E-02 7.59E-02 1.33E-03 7.96E-02 7.23E-02 7.59E-02 1.33E-03 7.96E-02 7.23E-02 7.28E-02 1.01E-03 7.55E-02 7.00E-02 1.50E-01 PASS 7.32E-02 1.02E-03 7.60E-02 7.04E-02 1.50E-01 PASS 7.36E-02 1.07E-03 7.65E-02 7.07E-02 1.50E-01 PASS 7.38E-02 1.10E-03 7.68E-02 7.08E-02 1.50E-01 PASS 7.43E-02 1.06E-03 7.72E-02 7.14E-02 1.50E-01 PASS 7.45E-02 1.00E-03 7.73E-02 7.18E-02 1.50E-01 PASS 7.45E-02 1.00E-03 7.73E-02 7.18E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 158 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.76. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 159 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.76. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.33E-02 7.42E-02 6.97E-02 7.55E-02 7.12E-02 7.26E-02 7.27E-02 6.91E-02 7.11E-02 7.27E-02 7.25E-02 10 7.40E-02 7.56E-02 7.09E-02 7.65E-02 7.22E-02 7.29E-02 7.31E-02 6.95E-02 7.14E-02 7.33E-02 7.25E-02 20 7.47E-02 7.62E-02 7.14E-02 7.73E-02 7.28E-02 7.34E-02 7.34E-02 7.00E-02 7.17E-02 7.37E-02 7.25E-02 30 7.55E-02 7.67E-02 7.18E-02 7.78E-02 7.35E-02 7.35E-02 7.36E-02 7.03E-02 7.21E-02 7.40E-02 7.25E-02 50 7.57E-02 7.70E-02 7.21E-02 7.84E-02 7.39E-02 7.41E-02 7.41E-02 7.07E-02 7.25E-02 7.44E-02 7.25E-02 60 7.67E-02 7.79E-02 7.29E-02 7.93E-02 7.43E-02 7.42E-02 7.42E-02 7.09E-02 7.28E-02 7.44E-02 7.23E-02 70 7.67E-02 7.79E-02 7.29E-02 7.93E-02 7.43E-02 7.42E-02 7.42E-02 7.09E-02 7.28E-02 7.44E-02 7.23E-02 7.28E-02 2.32E-03 7.91E-02 6.64E-02 7.39E-02 2.32E-03 8.02E-02 6.75E-02 7.45E-02 2.40E-03 8.11E-02 6.79E-02 7.51E-02 2.41E-03 8.17E-02 6.85E-02 7.54E-02 2.49E-03 8.22E-02 6.86E-02 7.62E-02 2.60E-03 8.34E-02 6.91E-02 7.62E-02 2.60E-03 8.34E-02 6.91E-02 7.16E-02 1.58E-03 7.60E-02 6.73E-02 1.50E-01 PASS 7.20E-02 1.60E-03 7.64E-02 6.76E-02 1.50E-01 PASS 7.24E-02 1.57E-03 7.67E-02 6.81E-02 1.50E-01 PASS 7.27E-02 1.53E-03 7.69E-02 6.85E-02 1.50E-01 PASS 7.31E-02 1.56E-03 7.74E-02 6.89E-02 1.50E-01 PASS 7.33E-02 1.48E-03 7.74E-02 6.93E-02 1.50E-01 PASS 7.33E-02 1.48E-03 7.74E-02 6.93E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 160 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.77. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 161 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.77. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.34E-02 7.43E-02 6.97E-02 7.55E-02 7.18E-02 7.26E-02 7.22E-02 6.92E-02 7.15E-02 7.28E-02 7.30E-02 10 7.41E-02 7.59E-02 7.09E-02 7.67E-02 7.26E-02 7.29E-02 7.25E-02 6.94E-02 7.18E-02 7.31E-02 7.26E-02 20 7.47E-02 7.62E-02 7.09E-02 7.74E-02 7.34E-02 7.33E-02 7.30E-02 6.98E-02 7.23E-02 7.34E-02 7.23E-02 30 7.54E-02 7.69E-02 7.18E-02 7.78E-02 7.38E-02 7.35E-02 7.35E-02 7.02E-02 7.25E-02 7.40E-02 7.27E-02 50 7.56E-02 7.73E-02 7.19E-02 7.83E-02 7.44E-02 7.38E-02 7.37E-02 7.06E-02 7.33E-02 7.44E-02 7.27E-02 60 7.65E-02 7.79E-02 7.27E-02 7.92E-02 7.50E-02 7.41E-02 7.39E-02 7.07E-02 7.31E-02 7.46E-02 7.27E-02 70 7.65E-02 7.79E-02 7.27E-02 7.92E-02 7.50E-02 7.41E-02 7.39E-02 7.07E-02 7.31E-02 7.46E-02 7.27E-02 7.29E-02 2.27E-03 7.92E-02 6.67E-02 7.40E-02 2.37E-03 8.05E-02 6.76E-02 7.45E-02 2.52E-03 8.14E-02 6.76E-02 7.51E-02 2.43E-03 8.18E-02 6.85E-02 7.55E-02 2.52E-03 8.24E-02 6.86E-02 7.63E-02 2.54E-03 8.32E-02 6.93E-02 7.63E-02 2.54E-03 8.32E-02 6.93E-02 7.17E-02 1.47E-03 7.57E-02 6.76E-02 1.50E-01 PASS 7.20E-02 1.48E-03 7.60E-02 6.79E-02 1.50E-01 PASS 7.24E-02 1.48E-03 7.64E-02 6.83E-02 1.50E-01 PASS 7.27E-02 1.52E-03 7.69E-02 6.86E-02 1.50E-01 PASS 7.32E-02 1.48E-03 7.72E-02 6.91E-02 1.50E-01 PASS 7.33E-02 1.54E-03 7.75E-02 6.90E-02 1.50E-01 PASS 7.33E-02 1.54E-03 7.75E-02 6.90E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 162 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.78. Plot of Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 163 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.78. Raw data for Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.46E-02 7.22E-02 7.32E-02 7.19E-02 7.26E-02 7.38E-02 7.17E-02 7.31E-02 7.14E-02 7.40E-02 7.42E-02 10 7.52E-02 7.33E-02 7.44E-02 7.27E-02 7.37E-02 7.41E-02 7.21E-02 7.33E-02 7.18E-02 7.42E-02 7.40E-02 20 7.57E-02 7.39E-02 7.47E-02 7.31E-02 7.40E-02 7.47E-02 7.24E-02 7.38E-02 7.21E-02 7.46E-02 7.41E-02 30 7.64E-02 7.46E-02 7.56E-02 7.35E-02 7.46E-02 7.48E-02 7.26E-02 7.41E-02 7.24E-02 7.49E-02 7.39E-02 50 7.68E-02 7.47E-02 7.59E-02 7.38E-02 7.48E-02 7.53E-02 7.30E-02 7.45E-02 7.30E-02 7.54E-02 7.41E-02 60 7.76E-02 7.57E-02 7.64E-02 7.47E-02 7.55E-02 7.55E-02 7.35E-02 7.47E-02 7.28E-02 7.55E-02 7.40E-02 70 7.76E-02 7.57E-02 7.64E-02 7.47E-02 7.55E-02 7.55E-02 7.35E-02 7.47E-02 7.28E-02 7.55E-02 7.40E-02 7.29E-02 1.06E-03 7.58E-02 7.00E-02 7.39E-02 9.78E-04 7.66E-02 7.12E-02 7.43E-02 9.80E-04 7.70E-02 7.16E-02 7.49E-02 1.09E-03 7.79E-02 7.20E-02 7.52E-02 1.15E-03 7.83E-02 7.20E-02 7.60E-02 1.10E-03 7.90E-02 7.30E-02 7.60E-02 1.10E-03 7.90E-02 7.30E-02 7.28E-02 1.20E-03 7.61E-02 6.95E-02 1.50E-01 PASS 7.31E-02 1.12E-03 7.62E-02 7.00E-02 1.50E-01 PASS 7.35E-02 1.21E-03 7.68E-02 7.02E-02 1.50E-01 PASS 7.38E-02 1.19E-03 7.70E-02 7.05E-02 1.50E-01 PASS 7.42E-02 1.17E-03 7.74E-02 7.10E-02 1.50E-01 PASS 7.44E-02 1.22E-03 7.77E-02 7.11E-02 1.50E-01 PASS 7.44E-02 1.22E-03 7.77E-02 7.11E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 164 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 9.00E-01 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.79. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 165 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.79. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.55E-01 3.48E-01 3.50E-01 3.43E-01 3.46E-01 3.52E-01 3.45E-01 3.50E-01 3.44E-01 3.54E-01 3.52E-01 10 3.55E-01 3.51E-01 3.53E-01 3.45E-01 3.48E-01 3.53E-01 3.46E-01 3.51E-01 3.45E-01 3.54E-01 3.51E-01 20 3.56E-01 3.53E-01 3.54E-01 3.46E-01 3.49E-01 3.54E-01 3.47E-01 3.52E-01 3.45E-01 3.55E-01 3.51E-01 30 3.58E-01 3.55E-01 3.57E-01 3.47E-01 3.51E-01 3.55E-01 3.47E-01 3.52E-01 3.47E-01 3.56E-01 3.52E-01 50 3.60E-01 3.56E-01 3.57E-01 3.48E-01 3.52E-01 3.57E-01 3.49E-01 3.54E-01 3.49E-01 3.58E-01 3.52E-01 60 3.62E-01 3.59E-01 3.61E-01 3.52E-01 3.55E-01 3.58E-01 3.50E-01 3.55E-01 3.49E-01 3.59E-01 3.51E-01 70 3.62E-01 3.59E-01 3.61E-01 3.52E-01 3.55E-01 3.58E-01 3.50E-01 3.55E-01 3.49E-01 3.59E-01 3.51E-01 3.48E-01 4.77E-03 3.61E-01 3.35E-01 3.50E-01 4.05E-03 3.61E-01 3.39E-01 3.52E-01 4.16E-03 3.63E-01 3.40E-01 3.54E-01 4.32E-03 3.65E-01 3.42E-01 3.55E-01 4.44E-03 3.67E-01 3.42E-01 3.58E-01 4.39E-03 3.70E-01 3.46E-01 3.58E-01 4.39E-03 3.70E-01 3.46E-01 3.49E-01 4.33E-03 3.61E-01 3.37E-01 8.00E-01 PASS 3.50E-01 4.33E-03 3.61E-01 3.38E-01 8.00E-01 PASS 3.51E-01 4.38E-03 3.63E-01 3.39E-01 8.00E-01 PASS 3.52E-01 4.34E-03 3.63E-01 3.40E-01 8.00E-01 PASS 3.53E-01 4.15E-03 3.65E-01 3.42E-01 8.00E-01 PASS 3.54E-01 4.35E-03 3.66E-01 3.42E-01 8.00E-01 PASS 3.54E-01 4.35E-03 3.66E-01 3.42E-01 8.00E-01 PASS An ISO 9001:2000 Certified Company 166 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 9.00E-01 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.80. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 167 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.80. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.50E-01 3.53E-01 3.38E-01 3.58E-01 3.41E-01 3.48E-01 3.46E-01 3.36E-01 3.43E-01 3.50E-01 3.49E-01 10 3.49E-01 3.58E-01 3.41E-01 3.61E-01 3.45E-01 3.48E-01 3.47E-01 3.36E-01 3.43E-01 3.50E-01 3.48E-01 20 3.50E-01 3.59E-01 3.42E-01 3.63E-01 3.46E-01 3.49E-01 3.48E-01 3.37E-01 3.44E-01 3.51E-01 3.47E-01 30 3.53E-01 3.62E-01 3.45E-01 3.65E-01 3.48E-01 3.51E-01 3.49E-01 3.38E-01 3.45E-01 3.52E-01 3.48E-01 50 3.54E-01 3.63E-01 3.45E-01 3.67E-01 3.50E-01 3.52E-01 3.50E-01 3.39E-01 3.47E-01 3.54E-01 3.48E-01 60 3.57E-01 3.66E-01 3.48E-01 3.70E-01 3.52E-01 3.53E-01 3.51E-01 3.40E-01 3.48E-01 3.55E-01 3.48E-01 70 3.57E-01 3.66E-01 3.48E-01 3.70E-01 3.52E-01 3.53E-01 3.51E-01 3.40E-01 3.48E-01 3.55E-01 3.48E-01 3.48E-01 8.10E-03 3.70E-01 3.26E-01 3.51E-01 8.46E-03 3.74E-01 3.28E-01 3.52E-01 8.81E-03 3.76E-01 3.28E-01 3.54E-01 8.81E-03 3.79E-01 3.30E-01 3.56E-01 9.22E-03 3.81E-01 3.30E-01 3.59E-01 9.24E-03 3.84E-01 3.33E-01 3.59E-01 9.24E-03 3.84E-01 3.33E-01 3.45E-01 5.44E-03 3.59E-01 3.30E-01 8.00E-01 PASS 3.45E-01 5.40E-03 3.60E-01 3.30E-01 8.00E-01 PASS 3.46E-01 5.56E-03 3.61E-01 3.31E-01 8.00E-01 PASS 3.47E-01 5.82E-03 3.63E-01 3.31E-01 8.00E-01 PASS 3.49E-01 5.65E-03 3.64E-01 3.33E-01 8.00E-01 PASS 3.50E-01 5.75E-03 3.65E-01 3.34E-01 8.00E-01 PASS 3.50E-01 5.75E-03 3.65E-01 3.34E-01 8.00E-01 PASS An ISO 9001:2000 Certified Company 168 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 9.00E-01 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.81. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 169 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.81. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.49E-01 3.54E-01 3.37E-01 3.57E-01 3.43E-01 3.47E-01 3.45E-01 3.36E-01 3.44E-01 3.50E-01 3.49E-01 10 3.49E-01 3.58E-01 3.40E-01 3.61E-01 3.46E-01 3.48E-01 3.46E-01 3.36E-01 3.44E-01 3.50E-01 3.48E-01 20 3.50E-01 3.60E-01 3.42E-01 3.63E-01 3.48E-01 3.49E-01 3.47E-01 3.37E-01 3.45E-01 3.51E-01 3.47E-01 30 3.52E-01 3.62E-01 3.43E-01 3.65E-01 3.50E-01 3.50E-01 3.48E-01 3.38E-01 3.47E-01 3.53E-01 3.48E-01 50 3.53E-01 3.63E-01 3.44E-01 3.67E-01 3.51E-01 3.51E-01 3.49E-01 3.39E-01 3.48E-01 3.54E-01 3.49E-01 60 3.57E-01 3.67E-01 3.47E-01 3.70E-01 3.53E-01 3.53E-01 3.50E-01 3.41E-01 3.49E-01 3.55E-01 3.48E-01 70 3.57E-01 3.67E-01 3.47E-01 3.70E-01 3.53E-01 3.53E-01 3.50E-01 3.41E-01 3.49E-01 3.55E-01 3.48E-01 3.48E-01 8.03E-03 3.70E-01 3.26E-01 3.51E-01 8.58E-03 3.74E-01 3.27E-01 3.52E-01 8.82E-03 3.77E-01 3.28E-01 3.55E-01 8.81E-03 3.79E-01 3.30E-01 3.56E-01 9.34E-03 3.81E-01 3.30E-01 3.59E-01 9.29E-03 3.84E-01 3.33E-01 3.59E-01 9.29E-03 3.84E-01 3.33E-01 3.44E-01 5.24E-03 3.59E-01 3.30E-01 8.00E-01 PASS 3.45E-01 5.28E-03 3.59E-01 3.30E-01 8.00E-01 PASS 3.46E-01 5.29E-03 3.60E-01 3.31E-01 8.00E-01 PASS 3.47E-01 5.74E-03 3.63E-01 3.31E-01 8.00E-01 PASS 3.48E-01 5.62E-03 3.64E-01 3.33E-01 8.00E-01 PASS 3.50E-01 5.44E-03 3.64E-01 3.35E-01 8.00E-01 PASS 3.50E-01 5.44E-03 3.64E-01 3.35E-01 8.00E-01 PASS An ISO 9001:2000 Certified Company 170 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 9.00E-01 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.82. Plot of Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 171 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.82. Raw data for Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.55E-01 3.47E-01 3.52E-01 3.43E-01 3.46E-01 3.51E-01 3.45E-01 3.51E-01 3.43E-01 3.54E-01 3.53E-01 10 3.54E-01 3.50E-01 3.55E-01 3.45E-01 3.49E-01 3.52E-01 3.45E-01 3.52E-01 3.44E-01 3.54E-01 3.52E-01 20 3.55E-01 3.52E-01 3.56E-01 3.46E-01 3.50E-01 3.54E-01 3.46E-01 3.53E-01 3.45E-01 3.56E-01 3.52E-01 30 3.57E-01 3.54E-01 3.59E-01 3.48E-01 3.52E-01 3.55E-01 3.47E-01 3.54E-01 3.46E-01 3.56E-01 3.53E-01 50 3.58E-01 3.55E-01 3.60E-01 3.49E-01 3.53E-01 3.56E-01 3.48E-01 3.55E-01 3.48E-01 3.58E-01 3.53E-01 60 3.61E-01 3.58E-01 3.62E-01 3.52E-01 3.56E-01 3.57E-01 3.49E-01 3.57E-01 3.49E-01 3.59E-01 3.53E-01 70 3.61E-01 3.58E-01 3.62E-01 3.52E-01 3.56E-01 3.57E-01 3.49E-01 3.57E-01 3.49E-01 3.59E-01 3.53E-01 3.48E-01 4.79E-03 3.62E-01 3.35E-01 3.51E-01 3.89E-03 3.61E-01 3.40E-01 3.52E-01 3.94E-03 3.63E-01 3.41E-01 3.54E-01 4.26E-03 3.66E-01 3.42E-01 3.55E-01 4.19E-03 3.66E-01 3.43E-01 3.58E-01 4.03E-03 3.69E-01 3.47E-01 3.58E-01 4.03E-03 3.69E-01 3.47E-01 3.49E-01 4.71E-03 3.62E-01 3.36E-01 8.00E-01 PASS 3.49E-01 4.66E-03 3.62E-01 3.37E-01 8.00E-01 PASS 3.51E-01 4.81E-03 3.64E-01 3.38E-01 8.00E-01 PASS 3.52E-01 4.69E-03 3.64E-01 3.39E-01 8.00E-01 PASS 3.53E-01 4.72E-03 3.66E-01 3.40E-01 8.00E-01 PASS 3.54E-01 4.79E-03 3.67E-01 3.41E-01 8.00E-01 PASS 3.54E-01 4.79E-03 3.67E-01 3.41E-01 8.00E-01 PASS An ISO 9001:2000 Certified Company 172 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.83. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 173 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.83. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.99E-02 1.99E-02 1.96E-02 2.03E-02 1.98E-02 1.94E-02 1.94E-02 1.93E-02 2.02E-02 1.99E-02 1.99E-02 10 1.99E-02 2.04E-02 2.00E-02 2.07E-02 2.01E-02 1.96E-02 1.95E-02 1.95E-02 2.04E-02 2.00E-02 1.98E-02 20 1.98E-02 2.06E-02 2.02E-02 2.08E-02 2.04E-02 1.97E-02 1.96E-02 1.94E-02 2.03E-02 2.01E-02 1.97E-02 30 2.01E-02 2.07E-02 2.05E-02 2.08E-02 2.05E-02 1.98E-02 1.98E-02 1.95E-02 2.06E-02 2.02E-02 1.99E-02 50 2.02E-02 2.11E-02 2.07E-02 2.11E-02 2.06E-02 2.01E-02 2.01E-02 1.99E-02 2.07E-02 2.03E-02 1.97E-02 60 2.05E-02 2.12E-02 2.07E-02 2.15E-02 2.09E-02 2.01E-02 2.00E-02 2.00E-02 2.10E-02 2.06E-02 1.96E-02 70 2.05E-02 2.12E-02 2.07E-02 2.15E-02 2.09E-02 2.01E-02 2.00E-02 2.00E-02 2.10E-02 2.06E-02 1.96E-02 1.99E-02 2.57E-04 2.06E-02 1.92E-02 2.02E-02 3.44E-04 2.12E-02 1.93E-02 2.04E-02 3.61E-04 2.13E-02 1.94E-02 2.05E-02 2.52E-04 2.12E-02 1.98E-02 2.07E-02 3.60E-04 2.17E-02 1.97E-02 2.10E-02 3.97E-04 2.21E-02 1.99E-02 2.10E-02 3.97E-04 2.21E-02 1.99E-02 1.96E-02 3.96E-04 2.07E-02 1.85E-02 3.00E-02 PASS 1.98E-02 3.97E-04 2.09E-02 1.87E-02 6.00E-02 PASS 1.98E-02 3.50E-04 2.08E-02 1.89E-02 6.00E-02 PASS 2.00E-02 4.33E-04 2.12E-02 1.88E-02 6.00E-02 PASS 2.02E-02 2.88E-04 2.10E-02 1.94E-02 6.00E-02 PASS 2.03E-02 4.32E-04 2.15E-02 1.92E-02 6.00E-02 PASS 2.03E-02 4.32E-04 2.15E-02 1.92E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 174 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.84. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 175 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.84. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.11E-02 2.06E-02 2.07E-02 2.10E-02 2.07E-02 2.01E-02 2.07E-02 1.97E-02 2.02E-02 1.89E-02 2.03E-02 10 2.12E-02 2.10E-02 2.10E-02 2.14E-02 2.12E-02 2.03E-02 2.05E-02 1.99E-02 2.03E-02 1.89E-02 2.02E-02 20 2.14E-02 2.14E-02 2.11E-02 2.19E-02 2.15E-02 2.04E-02 2.06E-02 2.00E-02 2.05E-02 1.89E-02 2.02E-02 30 2.15E-02 2.15E-02 2.13E-02 2.19E-02 2.17E-02 2.04E-02 2.08E-02 2.00E-02 2.05E-02 1.90E-02 2.02E-02 50 2.17E-02 2.18E-02 2.15E-02 2.22E-02 2.19E-02 2.06E-02 2.09E-02 2.02E-02 2.10E-02 1.95E-02 2.02E-02 60 2.20E-02 2.19E-02 2.19E-02 2.22E-02 2.21E-02 2.09E-02 2.12E-02 2.03E-02 2.10E-02 1.94E-02 2.04E-02 70 2.20E-02 2.19E-02 2.19E-02 2.22E-02 2.21E-02 2.09E-02 2.12E-02 2.03E-02 2.10E-02 1.94E-02 2.04E-02 2.08E-02 2.10E-04 2.14E-02 2.03E-02 2.12E-02 1.84E-04 2.17E-02 2.07E-02 2.14E-02 2.91E-04 2.22E-02 2.06E-02 2.16E-02 2.12E-04 2.21E-02 2.10E-02 2.18E-02 2.44E-04 2.25E-02 2.11E-02 2.20E-02 1.39E-04 2.24E-02 2.17E-02 2.20E-02 1.39E-04 2.24E-02 2.17E-02 1.99E-02 6.74E-04 2.17E-02 1.80E-02 3.00E-02 PASS 2.00E-02 6.43E-04 2.17E-02 1.82E-02 6.00E-02 PASS 2.01E-02 7.08E-04 2.20E-02 1.81E-02 6.00E-02 PASS 2.02E-02 7.00E-04 2.21E-02 1.82E-02 6.00E-02 PASS 2.04E-02 5.94E-04 2.21E-02 1.88E-02 6.00E-02 PASS 2.06E-02 7.20E-04 2.25E-02 1.86E-02 6.00E-02 PASS 2.06E-02 7.20E-04 2.25E-02 1.86E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 176 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.85. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 177 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.85. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.06E-02 2.00E-02 2.03E-02 2.08E-02 2.08E-02 1.98E-02 2.01E-02 1.97E-02 2.03E-02 1.95E-02 1.99E-02 10 2.07E-02 2.05E-02 2.07E-02 2.13E-02 2.12E-02 1.97E-02 2.02E-02 2.00E-02 2.03E-02 1.97E-02 1.96E-02 20 2.09E-02 2.06E-02 2.08E-02 2.16E-02 2.13E-02 2.01E-02 2.04E-02 2.00E-02 2.04E-02 1.96E-02 1.97E-02 30 2.10E-02 2.10E-02 2.11E-02 2.18E-02 2.16E-02 2.01E-02 2.06E-02 2.00E-02 2.07E-02 1.98E-02 1.98E-02 50 2.12E-02 2.10E-02 2.12E-02 2.20E-02 2.18E-02 2.02E-02 2.06E-02 2.03E-02 2.10E-02 2.00E-02 1.98E-02 60 2.15E-02 2.13E-02 2.16E-02 2.22E-02 2.22E-02 2.04E-02 2.08E-02 2.06E-02 2.10E-02 2.01E-02 1.98E-02 70 2.15E-02 2.13E-02 2.16E-02 2.22E-02 2.22E-02 2.04E-02 2.08E-02 2.06E-02 2.10E-02 2.01E-02 1.98E-02 2.05E-02 3.34E-04 2.14E-02 1.96E-02 2.09E-02 3.48E-04 2.18E-02 1.99E-02 2.10E-02 3.99E-04 2.21E-02 1.99E-02 2.13E-02 3.90E-04 2.24E-02 2.02E-02 2.14E-02 4.24E-04 2.26E-02 2.03E-02 2.18E-02 4.00E-04 2.29E-02 2.07E-02 2.18E-02 4.00E-04 2.29E-02 2.07E-02 1.99E-02 3.08E-04 2.07E-02 1.90E-02 3.00E-02 PASS 2.00E-02 2.85E-04 2.08E-02 1.92E-02 6.00E-02 PASS 2.01E-02 3.48E-04 2.10E-02 1.91E-02 6.00E-02 PASS 2.02E-02 3.93E-04 2.13E-02 1.92E-02 6.00E-02 PASS 2.04E-02 3.72E-04 2.14E-02 1.94E-02 6.00E-02 PASS 2.06E-02 3.81E-04 2.16E-02 1.95E-02 6.00E-02 PASS 2.06E-02 3.81E-04 2.16E-02 1.95E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 178 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.86. Plot of Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 179 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.86. Raw data for Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.00E-02 2.01E-02 2.03E-02 2.07E-02 2.01E-02 1.97E-02 1.95E-02 1.97E-02 2.07E-02 2.02E-02 2.03E-02 10 2.01E-02 2.06E-02 2.07E-02 2.12E-02 2.06E-02 1.98E-02 1.97E-02 1.98E-02 2.06E-02 2.02E-02 2.01E-02 20 2.02E-02 2.08E-02 2.09E-02 2.11E-02 2.06E-02 2.01E-02 2.00E-02 1.99E-02 2.09E-02 2.03E-02 2.01E-02 30 2.06E-02 2.10E-02 2.11E-02 2.14E-02 2.07E-02 2.02E-02 1.99E-02 2.00E-02 2.11E-02 2.05E-02 2.01E-02 50 2.07E-02 2.11E-02 2.12E-02 2.15E-02 2.10E-02 2.03E-02 2.01E-02 2.02E-02 2.13E-02 2.07E-02 2.01E-02 60 2.09E-02 2.14E-02 2.14E-02 2.18E-02 2.14E-02 2.04E-02 2.03E-02 2.04E-02 2.13E-02 2.07E-02 2.01E-02 70 2.09E-02 2.14E-02 2.14E-02 2.18E-02 2.14E-02 2.04E-02 2.03E-02 2.04E-02 2.13E-02 2.07E-02 2.01E-02 2.02E-02 2.77E-04 2.10E-02 1.95E-02 2.06E-02 3.92E-04 2.17E-02 1.95E-02 2.07E-02 3.57E-04 2.17E-02 1.97E-02 2.09E-02 3.27E-04 2.18E-02 2.00E-02 2.11E-02 2.79E-04 2.19E-02 2.03E-02 2.14E-02 3.16E-04 2.23E-02 2.05E-02 2.14E-02 3.16E-04 2.23E-02 2.05E-02 2.00E-02 4.75E-04 2.13E-02 1.86E-02 3.00E-02 PASS 2.00E-02 4.03E-04 2.11E-02 1.89E-02 6.00E-02 PASS 2.02E-02 4.12E-04 2.14E-02 1.91E-02 6.00E-02 PASS 2.03E-02 4.78E-04 2.16E-02 1.90E-02 6.00E-02 PASS 2.05E-02 4.89E-04 2.18E-02 1.92E-02 6.00E-02 PASS 2.06E-02 4.10E-04 2.18E-02 1.95E-02 6.00E-02 PASS 2.06E-02 4.10E-04 2.18E-02 1.95E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 180 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.87. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 181 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.87. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.47E-02 5.50E-02 5.48E-02 5.46E-02 5.43E-02 5.43E-02 5.38E-02 5.42E-02 5.47E-02 5.51E-02 5.43E-02 10 5.44E-02 5.55E-02 5.52E-02 5.50E-02 5.46E-02 5.42E-02 5.38E-02 5.42E-02 5.46E-02 5.49E-02 5.41E-02 20 5.46E-02 5.58E-02 5.54E-02 5.51E-02 5.50E-02 5.42E-02 5.38E-02 5.42E-02 5.49E-02 5.51E-02 5.40E-02 30 5.49E-02 5.59E-02 5.58E-02 5.54E-02 5.51E-02 5.44E-02 5.40E-02 5.45E-02 5.51E-02 5.54E-02 5.41E-02 50 5.52E-02 5.62E-02 5.59E-02 5.54E-02 5.54E-02 5.47E-02 5.43E-02 5.45E-02 5.52E-02 5.55E-02 5.42E-02 60 5.55E-02 5.66E-02 5.64E-02 5.61E-02 5.58E-02 5.49E-02 5.46E-02 5.47E-02 5.54E-02 5.57E-02 5.41E-02 70 5.55E-02 5.66E-02 5.64E-02 5.61E-02 5.58E-02 5.49E-02 5.46E-02 5.47E-02 5.54E-02 5.57E-02 5.41E-02 5.47E-02 2.73E-04 5.54E-02 5.39E-02 5.49E-02 4.38E-04 5.61E-02 5.37E-02 5.52E-02 4.18E-04 5.63E-02 5.40E-02 5.54E-02 4.46E-04 5.66E-02 5.42E-02 5.56E-02 4.23E-04 5.68E-02 5.44E-02 5.61E-02 4.23E-04 5.73E-02 5.49E-02 5.61E-02 4.23E-04 5.73E-02 5.49E-02 5.44E-02 5.00E-04 5.58E-02 5.31E-02 1.00E-01 PASS 5.43E-02 4.14E-04 5.55E-02 5.32E-02 1.00E-01 PASS 5.44E-02 5.39E-04 5.59E-02 5.30E-02 1.00E-01 PASS 5.47E-02 5.46E-04 5.61E-02 5.32E-02 1.00E-01 PASS 5.48E-02 4.81E-04 5.62E-02 5.35E-02 1.00E-01 PASS 5.51E-02 4.75E-04 5.64E-02 5.38E-02 1.00E-01 PASS 5.51E-02 4.75E-04 5.64E-02 5.38E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 182 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.88. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 183 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.88. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.62E-02 5.56E-02 5.46E-02 5.67E-02 5.54E-02 5.54E-02 5.49E-02 5.37E-02 5.46E-02 5.39E-02 5.54E-02 10 5.59E-02 5.60E-02 5.50E-02 5.71E-02 5.60E-02 5.52E-02 5.51E-02 5.35E-02 5.48E-02 5.39E-02 5.50E-02 20 5.63E-02 5.64E-02 5.55E-02 5.75E-02 5.60E-02 5.54E-02 5.52E-02 5.38E-02 5.47E-02 5.40E-02 5.50E-02 30 5.65E-02 5.67E-02 5.58E-02 5.77E-02 5.66E-02 5.56E-02 5.53E-02 5.38E-02 5.51E-02 5.41E-02 5.51E-02 50 5.66E-02 5.68E-02 5.58E-02 5.79E-02 5.67E-02 5.58E-02 5.55E-02 5.40E-02 5.53E-02 5.45E-02 5.53E-02 60 5.75E-02 5.75E-02 5.63E-02 5.85E-02 5.73E-02 5.60E-02 5.57E-02 5.43E-02 5.54E-02 5.44E-02 5.53E-02 70 5.75E-02 5.75E-02 5.63E-02 5.85E-02 5.73E-02 5.60E-02 5.57E-02 5.43E-02 5.54E-02 5.44E-02 5.53E-02 5.57E-02 7.97E-04 5.79E-02 5.35E-02 5.60E-02 7.27E-04 5.80E-02 5.40E-02 5.63E-02 7.30E-04 5.83E-02 5.43E-02 5.66E-02 6.91E-04 5.85E-02 5.47E-02 5.68E-02 7.59E-04 5.89E-02 5.47E-02 5.74E-02 7.82E-04 5.96E-02 5.53E-02 5.74E-02 7.82E-04 5.96E-02 5.53E-02 5.45E-02 7.04E-04 5.64E-02 5.26E-02 1.00E-01 PASS 5.45E-02 7.59E-04 5.66E-02 5.24E-02 1.00E-01 PASS 5.46E-02 7.16E-04 5.66E-02 5.27E-02 1.00E-01 PASS 5.48E-02 7.48E-04 5.68E-02 5.27E-02 1.00E-01 PASS 5.50E-02 7.31E-04 5.70E-02 5.30E-02 1.00E-01 PASS 5.52E-02 7.62E-04 5.73E-02 5.31E-02 1.00E-01 PASS 5.52E-02 7.62E-04 5.73E-02 5.31E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 184 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.89. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 185 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.89. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.56E-02 5.45E-02 5.42E-02 5.61E-02 5.50E-02 5.46E-02 5.45E-02 5.32E-02 5.44E-02 5.40E-02 5.46E-02 10 5.55E-02 5.53E-02 5.46E-02 5.65E-02 5.55E-02 5.46E-02 5.46E-02 5.32E-02 5.46E-02 5.39E-02 5.44E-02 20 5.58E-02 5.55E-02 5.48E-02 5.68E-02 5.57E-02 5.47E-02 5.44E-02 5.35E-02 5.46E-02 5.43E-02 5.42E-02 30 5.61E-02 5.59E-02 5.50E-02 5.71E-02 5.61E-02 5.47E-02 5.47E-02 5.36E-02 5.50E-02 5.42E-02 5.43E-02 50 5.61E-02 5.62E-02 5.52E-02 5.73E-02 5.64E-02 5.49E-02 5.48E-02 5.37E-02 5.51E-02 5.47E-02 5.45E-02 60 5.66E-02 5.65E-02 5.59E-02 5.79E-02 5.69E-02 5.51E-02 5.52E-02 5.41E-02 5.52E-02 5.47E-02 5.43E-02 70 5.66E-02 5.65E-02 5.59E-02 5.79E-02 5.69E-02 5.51E-02 5.52E-02 5.41E-02 5.52E-02 5.47E-02 5.43E-02 5.51E-02 7.89E-04 5.72E-02 5.29E-02 5.55E-02 6.98E-04 5.74E-02 5.36E-02 5.57E-02 6.92E-04 5.76E-02 5.38E-02 5.60E-02 7.53E-04 5.81E-02 5.40E-02 5.62E-02 7.42E-04 5.83E-02 5.42E-02 5.68E-02 7.21E-04 5.87E-02 5.48E-02 5.68E-02 7.21E-04 5.87E-02 5.48E-02 5.42E-02 5.61E-04 5.57E-02 5.26E-02 1.00E-01 PASS 5.42E-02 6.14E-04 5.59E-02 5.25E-02 1.00E-01 PASS 5.43E-02 4.52E-04 5.55E-02 5.31E-02 1.00E-01 PASS 5.45E-02 5.76E-04 5.60E-02 5.29E-02 1.00E-01 PASS 5.46E-02 5.20E-04 5.61E-02 5.32E-02 1.00E-01 PASS 5.48E-02 4.80E-04 5.62E-02 5.35E-02 1.00E-01 PASS 5.48E-02 4.80E-04 5.62E-02 5.35E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 186 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.90. Plot of Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 187 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.90. Raw data for Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.53E-02 5.53E-02 5.54E-02 5.52E-02 5.46E-02 5.47E-02 5.41E-02 5.47E-02 5.56E-02 5.55E-02 5.49E-02 10 5.50E-02 5.59E-02 5.60E-02 5.56E-02 5.51E-02 5.48E-02 5.42E-02 5.48E-02 5.55E-02 5.53E-02 5.46E-02 20 5.51E-02 5.58E-02 5.62E-02 5.59E-02 5.53E-02 5.50E-02 5.42E-02 5.49E-02 5.54E-02 5.56E-02 5.45E-02 30 5.55E-02 5.64E-02 5.66E-02 5.62E-02 5.56E-02 5.50E-02 5.45E-02 5.48E-02 5.57E-02 5.55E-02 5.47E-02 50 5.57E-02 5.65E-02 5.68E-02 5.63E-02 5.58E-02 5.51E-02 5.47E-02 5.53E-02 5.60E-02 5.58E-02 5.48E-02 60 5.63E-02 5.71E-02 5.72E-02 5.68E-02 5.63E-02 5.55E-02 5.48E-02 5.53E-02 5.61E-02 5.60E-02 5.46E-02 70 5.63E-02 5.71E-02 5.72E-02 5.68E-02 5.63E-02 5.55E-02 5.48E-02 5.53E-02 5.61E-02 5.60E-02 5.46E-02 5.52E-02 3.33E-04 5.61E-02 5.43E-02 5.55E-02 4.50E-04 5.67E-02 5.43E-02 5.57E-02 4.68E-04 5.69E-02 5.44E-02 5.60E-02 5.04E-04 5.74E-02 5.47E-02 5.62E-02 4.60E-04 5.75E-02 5.50E-02 5.67E-02 4.55E-04 5.80E-02 5.55E-02 5.67E-02 4.55E-04 5.80E-02 5.55E-02 5.49E-02 6.09E-04 5.66E-02 5.32E-02 1.00E-01 PASS 5.49E-02 5.18E-04 5.63E-02 5.35E-02 1.00E-01 PASS 5.50E-02 5.13E-04 5.64E-02 5.36E-02 1.00E-01 PASS 5.51E-02 4.88E-04 5.64E-02 5.38E-02 1.00E-01 PASS 5.54E-02 5.37E-04 5.68E-02 5.39E-02 1.00E-01 PASS 5.56E-02 5.28E-04 5.70E-02 5.41E-02 1.00E-01 PASS 5.56E-02 5.28E-04 5.70E-02 5.41E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 188 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.91. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 189 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.91. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.19E-01 2.20E-01 2.20E-01 2.16E-01 2.16E-01 2.17E-01 2.17E-01 2.20E-01 2.16E-01 2.21E-01 2.16E-01 10 2.17E-01 2.21E-01 2.21E-01 2.16E-01 2.16E-01 2.17E-01 2.16E-01 2.20E-01 2.16E-01 2.21E-01 2.15E-01 20 2.17E-01 2.21E-01 2.21E-01 2.16E-01 2.16E-01 2.17E-01 2.16E-01 2.20E-01 2.16E-01 2.21E-01 2.15E-01 30 2.18E-01 2.22E-01 2.22E-01 2.16E-01 2.17E-01 2.17E-01 2.16E-01 2.20E-01 2.16E-01 2.21E-01 2.16E-01 50 2.18E-01 2.22E-01 2.22E-01 2.16E-01 2.17E-01 2.17E-01 2.17E-01 2.20E-01 2.16E-01 2.22E-01 2.15E-01 60 2.20E-01 2.24E-01 2.24E-01 2.19E-01 2.19E-01 2.18E-01 2.18E-01 2.22E-01 2.17E-01 2.22E-01 2.15E-01 70 2.20E-01 2.24E-01 2.24E-01 2.19E-01 2.19E-01 2.18E-01 2.18E-01 2.22E-01 2.17E-01 2.22E-01 2.15E-01 2.18E-01 2.30E-03 2.24E-01 2.12E-01 2.18E-01 2.65E-03 2.26E-01 2.11E-01 2.18E-01 2.70E-03 2.26E-01 2.11E-01 2.19E-01 2.78E-03 2.27E-01 2.12E-01 2.19E-01 2.67E-03 2.26E-01 2.12E-01 2.21E-01 2.43E-03 2.28E-01 2.15E-01 2.21E-01 2.43E-03 2.28E-01 2.15E-01 2.18E-01 2.38E-03 2.25E-01 2.12E-01 5.00E-01 PASS 2.18E-01 2.36E-03 2.24E-01 2.11E-01 5.00E-01 PASS 2.18E-01 2.42E-03 2.25E-01 2.11E-01 5.00E-01 PASS 2.18E-01 2.40E-03 2.25E-01 2.12E-01 5.00E-01 PASS 2.18E-01 2.46E-03 2.25E-01 2.12E-01 5.00E-01 PASS 2.19E-01 2.39E-03 2.26E-01 2.13E-01 5.00E-01 PASS 2.19E-01 2.39E-03 2.26E-01 2.13E-01 5.00E-01 PASS An ISO 9001:2000 Certified Company 190 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.92. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 191 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.92. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.21E-01 2.20E-01 2.17E-01 2.20E-01 2.17E-01 2.22E-01 2.18E-01 2.16E-01 2.18E-01 2.19E-01 2.21E-01 10 2.19E-01 2.21E-01 2.18E-01 2.20E-01 2.18E-01 2.21E-01 2.17E-01 2.16E-01 2.17E-01 2.19E-01 2.19E-01 20 2.19E-01 2.21E-01 2.18E-01 2.21E-01 2.19E-01 2.22E-01 2.17E-01 2.16E-01 2.17E-01 2.19E-01 2.19E-01 30 2.20E-01 2.22E-01 2.19E-01 2.22E-01 2.19E-01 2.22E-01 2.18E-01 2.16E-01 2.17E-01 2.19E-01 2.20E-01 50 2.20E-01 2.21E-01 2.19E-01 2.22E-01 2.19E-01 2.22E-01 2.18E-01 2.16E-01 2.18E-01 2.19E-01 2.20E-01 60 2.22E-01 2.24E-01 2.21E-01 2.24E-01 2.21E-01 2.23E-01 2.19E-01 2.18E-01 2.18E-01 2.20E-01 2.20E-01 70 2.22E-01 2.24E-01 2.21E-01 2.24E-01 2.21E-01 2.23E-01 2.19E-01 2.18E-01 2.18E-01 2.20E-01 2.20E-01 2.19E-01 1.60E-03 2.23E-01 2.15E-01 2.19E-01 1.36E-03 2.23E-01 2.16E-01 2.19E-01 1.33E-03 2.23E-01 2.16E-01 2.20E-01 1.47E-03 2.24E-01 2.16E-01 2.20E-01 1.33E-03 2.24E-01 2.16E-01 2.22E-01 1.44E-03 2.26E-01 2.18E-01 2.22E-01 1.44E-03 2.26E-01 2.18E-01 2.19E-01 2.24E-03 2.25E-01 2.13E-01 5.00E-01 PASS 2.18E-01 2.10E-03 2.24E-01 2.12E-01 5.00E-01 PASS 2.18E-01 2.38E-03 2.25E-01 2.12E-01 5.00E-01 PASS 2.18E-01 2.20E-03 2.24E-01 2.12E-01 5.00E-01 PASS 2.19E-01 2.15E-03 2.25E-01 2.13E-01 5.00E-01 PASS 2.20E-01 2.14E-03 2.25E-01 2.14E-01 5.00E-01 PASS 2.20E-01 2.14E-03 2.25E-01 2.14E-01 5.00E-01 PASS An ISO 9001:2000 Certified Company 192 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.93. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 193 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.93. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.19E-01 2.17E-01 2.15E-01 2.18E-01 2.15E-01 2.19E-01 2.16E-01 2.14E-01 2.16E-01 2.17E-01 2.18E-01 10 2.16E-01 2.18E-01 2.16E-01 2.18E-01 2.16E-01 2.19E-01 2.15E-01 2.14E-01 2.15E-01 2.16E-01 2.16E-01 20 2.17E-01 2.18E-01 2.16E-01 2.18E-01 2.16E-01 2.19E-01 2.15E-01 2.14E-01 2.15E-01 2.17E-01 2.17E-01 30 2.18E-01 2.19E-01 2.17E-01 2.19E-01 2.17E-01 2.19E-01 2.16E-01 2.14E-01 2.16E-01 2.17E-01 2.17E-01 50 2.18E-01 2.19E-01 2.17E-01 2.19E-01 2.16E-01 2.19E-01 2.16E-01 2.15E-01 2.15E-01 2.17E-01 2.17E-01 60 2.20E-01 2.22E-01 2.19E-01 2.22E-01 2.19E-01 2.20E-01 2.16E-01 2.16E-01 2.16E-01 2.18E-01 2.17E-01 70 2.20E-01 2.22E-01 2.19E-01 2.22E-01 2.19E-01 2.20E-01 2.16E-01 2.16E-01 2.16E-01 2.18E-01 2.17E-01 2.17E-01 1.47E-03 2.21E-01 2.13E-01 2.17E-01 1.22E-03 2.20E-01 2.13E-01 2.17E-01 1.28E-03 2.21E-01 2.14E-01 2.18E-01 1.32E-03 2.22E-01 2.14E-01 2.18E-01 1.25E-03 2.21E-01 2.14E-01 2.20E-01 1.47E-03 2.24E-01 2.16E-01 2.20E-01 1.47E-03 2.24E-01 2.16E-01 2.16E-01 1.76E-03 2.21E-01 2.11E-01 5.00E-01 PASS 2.16E-01 1.72E-03 2.20E-01 2.11E-01 5.00E-01 PASS 2.16E-01 1.79E-03 2.21E-01 2.11E-01 5.00E-01 PASS 2.16E-01 1.63E-03 2.21E-01 2.12E-01 5.00E-01 PASS 2.17E-01 1.65E-03 2.21E-01 2.12E-01 5.00E-01 PASS 2.17E-01 1.86E-03 2.22E-01 2.12E-01 5.00E-01 PASS 2.17E-01 1.86E-03 2.22E-01 2.12E-01 5.00E-01 PASS An ISO 9001:2000 Certified Company 194 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.94. Plot of Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 195 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.94. Raw data for Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.22E-01 2.22E-01 2.23E-01 2.18E-01 2.18E-01 2.20E-01 2.19E-01 2.23E-01 2.19E-01 2.23E-01 2.19E-01 10 2.20E-01 2.23E-01 2.23E-01 2.19E-01 2.19E-01 2.20E-01 2.18E-01 2.23E-01 2.18E-01 2.23E-01 2.18E-01 20 2.20E-01 2.24E-01 2.23E-01 2.19E-01 2.19E-01 2.20E-01 2.18E-01 2.22E-01 2.18E-01 2.23E-01 2.18E-01 30 2.21E-01 2.24E-01 2.25E-01 2.19E-01 2.19E-01 2.20E-01 2.19E-01 2.23E-01 2.19E-01 2.23E-01 2.18E-01 50 2.21E-01 2.25E-01 2.24E-01 2.19E-01 2.19E-01 2.20E-01 2.19E-01 2.23E-01 2.19E-01 2.23E-01 2.18E-01 60 2.23E-01 2.26E-01 2.26E-01 2.22E-01 2.22E-01 2.21E-01 2.20E-01 2.24E-01 2.20E-01 2.24E-01 2.18E-01 70 2.23E-01 2.26E-01 2.26E-01 2.22E-01 2.22E-01 2.21E-01 2.20E-01 2.24E-01 2.20E-01 2.24E-01 2.18E-01 2.21E-01 2.44E-03 2.27E-01 2.14E-01 2.21E-01 2.41E-03 2.27E-01 2.14E-01 2.21E-01 2.41E-03 2.28E-01 2.14E-01 2.22E-01 2.65E-03 2.29E-01 2.14E-01 2.22E-01 2.66E-03 2.29E-01 2.14E-01 2.24E-01 2.33E-03 2.30E-01 2.17E-01 2.24E-01 2.33E-03 2.30E-01 2.17E-01 2.21E-01 2.13E-03 2.27E-01 2.15E-01 5.00E-01 PASS 2.20E-01 2.34E-03 2.27E-01 2.14E-01 5.00E-01 PASS 2.20E-01 2.19E-03 2.26E-01 2.14E-01 5.00E-01 PASS 2.21E-01 2.09E-03 2.26E-01 2.15E-01 5.00E-01 PASS 2.21E-01 2.10E-03 2.27E-01 2.15E-01 5.00E-01 PASS 2.22E-01 2.28E-03 2.28E-01 2.15E-01 5.00E-01 PASS 2.22E-01 2.28E-03 2.28E-01 2.15E-01 5.00E-01 PASS An ISO 9001:2000 Certified Company 196 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Short-Circuit Current @ +/- 15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.95. Plot of Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 197 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.95. Raw data for Positive Short-Circuit Current @ +/- 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ +/- 15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.56E-02 -3.78E-02 -3.81E-02 -3.52E-02 -3.53E-02 -3.48E-02 -3.70E-02 -3.93E-02 -3.57E-02 -3.72E-02 -3.57E-02 10 -3.37E-02 -3.67E-02 -3.70E-02 -3.41E-02 -3.42E-02 -3.40E-02 -3.61E-02 -3.85E-02 -3.47E-02 -3.63E-02 -3.53E-02 20 -3.31E-02 -3.62E-02 -3.65E-02 -3.37E-02 -3.38E-02 -3.37E-02 -3.57E-02 -3.81E-02 -3.43E-02 -3.60E-02 -3.53E-02 30 -3.29E-02 -3.60E-02 -3.64E-02 -3.35E-02 -3.36E-02 -3.34E-02 -3.54E-02 -3.78E-02 -3.40E-02 -3.57E-02 -3.54E-02 50 -3.20E-02 -3.52E-02 -3.56E-02 -3.27E-02 -3.28E-02 -3.28E-02 -3.49E-02 -3.73E-02 -3.34E-02 -3.52E-02 -3.55E-02 60 -3.28E-02 -3.59E-02 -3.62E-02 -3.35E-02 -3.35E-02 -3.32E-02 -3.53E-02 -3.77E-02 -3.37E-02 -3.55E-02 -3.54E-02 70 -3.28E-02 -3.59E-02 -3.62E-02 -3.35E-02 -3.35E-02 -3.32E-02 -3.53E-02 -3.77E-02 -3.37E-02 -3.55E-02 -3.54E-02 -3.64E-02 1.43E-03 -3.25E-02 -4.03E-02 -3.51E-02 1.57E-03 -3.08E-02 -3.94E-02 -3.46E-02 1.57E-03 -3.03E-02 -3.90E-02 -3.45E-02 1.61E-03 -3.01E-02 -3.89E-02 -3.36E-02 1.62E-03 -2.92E-02 -3.81E-02 -3.44E-02 1.58E-03 -3.01E-02 -3.87E-02 -3.44E-02 1.58E-03 -3.01E-02 -3.87E-02 -3.68E-02 1.71E-03 -3.21E-02 -4.15E-02 -1.50E-02 PASS -3.59E-02 1.71E-03 -3.12E-02 -4.06E-02 -1.00E-02 PASS -3.55E-02 1.71E-03 -3.09E-02 -4.02E-02 -1.00E-02 PASS -3.53E-02 1.71E-03 -3.06E-02 -4.00E-02 -1.00E-02 PASS -3.47E-02 1.74E-03 -3.00E-02 -3.95E-02 -1.00E-02 PASS -3.51E-02 1.74E-03 -3.03E-02 -3.98E-02 -1.00E-02 PASS -3.51E-02 1.74E-03 -3.03E-02 -3.98E-02 -1.00E-02 PASS An ISO 9001:2000 Certified Company 198 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Short-Circuit Current @ +/- 15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.96. Plot of Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 199 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.96. Raw data for Positive Short-Circuit Current @ +/- 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ +/- 15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.52E-02 -3.57E-02 -3.87E-02 -3.21E-02 -3.55E-02 -3.82E-02 -3.49E-02 -4.00E-02 -3.71E-02 -3.84E-02 -3.76E-02 10 -3.33E-02 -3.46E-02 -3.75E-02 -3.08E-02 -3.43E-02 -3.75E-02 -3.40E-02 -3.91E-02 -3.60E-02 -3.74E-02 -3.72E-02 20 -3.27E-02 -3.40E-02 -3.70E-02 -3.02E-02 -3.37E-02 -3.71E-02 -3.36E-02 -3.87E-02 -3.56E-02 -3.70E-02 -3.72E-02 30 -3.25E-02 -3.39E-02 -3.69E-02 -3.00E-02 -3.34E-02 -3.69E-02 -3.34E-02 -3.84E-02 -3.53E-02 -3.67E-02 -3.73E-02 50 -3.15E-02 -3.30E-02 -3.61E-02 -2.91E-02 -3.26E-02 -3.63E-02 -3.29E-02 -3.79E-02 -3.48E-02 -3.62E-02 -3.74E-02 60 -3.23E-02 -3.38E-02 -3.67E-02 -2.99E-02 -3.33E-02 -3.67E-02 -3.32E-02 -3.82E-02 -3.51E-02 -3.65E-02 -3.73E-02 70 -3.23E-02 -3.38E-02 -3.67E-02 -2.99E-02 -3.33E-02 -3.67E-02 -3.32E-02 -3.82E-02 -3.51E-02 -3.65E-02 -3.73E-02 -3.54E-02 2.35E-03 -2.90E-02 -4.19E-02 -3.41E-02 2.44E-03 -2.74E-02 -4.08E-02 -3.35E-02 2.45E-03 -2.68E-02 -4.03E-02 -3.33E-02 2.50E-03 -2.64E-02 -4.02E-02 -3.24E-02 2.53E-03 -2.55E-02 -3.94E-02 -3.32E-02 2.48E-03 -2.64E-02 -4.00E-02 -3.32E-02 2.48E-03 -2.64E-02 -4.00E-02 -3.77E-02 1.91E-03 -3.25E-02 -4.29E-02 -1.50E-02 PASS -3.68E-02 1.90E-03 -3.16E-02 -4.20E-02 -1.00E-02 PASS -3.64E-02 1.90E-03 -3.12E-02 -4.16E-02 -1.00E-02 PASS -3.61E-02 1.88E-03 -3.10E-02 -4.13E-02 -1.00E-02 PASS -3.56E-02 1.87E-03 -3.04E-02 -4.07E-02 -1.00E-02 PASS -3.59E-02 1.88E-03 -3.08E-02 -4.11E-02 -1.00E-02 PASS -3.59E-02 1.88E-03 -3.08E-02 -4.11E-02 -1.00E-02 PASS An ISO 9001:2000 Certified Company 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Short-Circuit Current @ +/- 15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 -4.50E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.97. Plot of Positive Short-Circuit Current @ +/- 15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 201 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.97. Raw data for Positive Short-Circuit Current @ +/- 15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ +/- 15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.57E-02 -3.60E-02 -3.96E-02 -3.23E-02 -3.51E-02 -3.92E-02 -3.59E-02 -4.04E-02 -3.70E-02 -3.87E-02 -3.79E-02 10 -3.37E-02 -3.48E-02 -3.84E-02 -3.10E-02 -3.39E-02 -3.83E-02 -3.51E-02 -3.95E-02 -3.60E-02 -3.78E-02 -3.76E-02 20 -3.31E-02 -3.43E-02 -3.79E-02 -3.05E-02 -3.33E-02 -3.80E-02 -3.47E-02 -3.91E-02 -3.55E-02 -3.74E-02 -3.75E-02 30 -3.29E-02 -3.41E-02 -3.77E-02 -3.02E-02 -3.31E-02 -3.77E-02 -3.44E-02 -3.88E-02 -3.53E-02 -3.71E-02 -3.77E-02 50 -3.19E-02 -3.32E-02 -3.69E-02 -2.93E-02 -3.22E-02 -3.71E-02 -3.39E-02 -3.82E-02 -3.47E-02 -3.65E-02 -3.77E-02 60 -3.27E-02 -3.40E-02 -3.76E-02 -3.01E-02 -3.29E-02 -3.75E-02 -3.43E-02 -3.86E-02 -3.50E-02 -3.69E-02 -3.77E-02 70 -3.27E-02 -3.40E-02 -3.76E-02 -3.01E-02 -3.29E-02 -3.75E-02 -3.43E-02 -3.86E-02 -3.50E-02 -3.69E-02 -3.77E-02 -3.57E-02 2.59E-03 -2.86E-02 -4.28E-02 -3.44E-02 2.66E-03 -2.71E-02 -4.16E-02 -3.38E-02 2.67E-03 -2.65E-02 -4.11E-02 -3.36E-02 2.73E-03 -2.61E-02 -4.11E-02 -3.27E-02 2.74E-03 -2.52E-02 -4.02E-02 -3.35E-02 2.70E-03 -2.60E-02 -4.09E-02 -3.35E-02 2.70E-03 -2.60E-02 -4.09E-02 -3.83E-02 1.78E-03 -3.34E-02 -4.31E-02 -1.50E-02 PASS -3.73E-02 1.79E-03 -3.24E-02 -4.22E-02 -1.00E-02 PASS -3.69E-02 1.80E-03 -3.20E-02 -4.19E-02 -1.00E-02 PASS -3.67E-02 1.78E-03 -3.18E-02 -4.15E-02 -1.00E-02 PASS -3.61E-02 1.77E-03 -3.12E-02 -4.09E-02 -1.00E-02 PASS -3.65E-02 1.80E-03 -3.15E-02 -4.14E-02 -1.00E-02 PASS -3.65E-02 1.80E-03 -3.15E-02 -4.14E-02 -1.00E-02 PASS An ISO 9001:2000 Certified Company 202 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Short-Circuit Current @ +/- 15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.98. Plot of Positive Short-Circuit Current @ +/- 15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 203 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.98. Raw data for Positive Short-Circuit Current @ +/- 15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ +/- 15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.67E-02 -3.87E-02 -3.79E-02 -3.59E-02 -3.55E-02 -3.57E-02 -3.81E-02 -3.93E-02 -3.66E-02 -3.79E-02 -3.62E-02 10 -3.48E-02 -3.76E-02 -3.68E-02 -3.48E-02 -3.44E-02 -3.49E-02 -3.72E-02 -3.84E-02 -3.56E-02 -3.70E-02 -3.59E-02 20 -3.43E-02 -3.71E-02 -3.63E-02 -3.44E-02 -3.39E-02 -3.45E-02 -3.67E-02 -3.80E-02 -3.51E-02 -3.66E-02 -3.59E-02 30 -3.41E-02 -3.69E-02 -3.62E-02 -3.41E-02 -3.37E-02 -3.43E-02 -3.65E-02 -3.78E-02 -3.49E-02 -3.63E-02 -3.60E-02 50 -3.31E-02 -3.60E-02 -3.54E-02 -3.33E-02 -3.30E-02 -3.37E-02 -3.59E-02 -3.72E-02 -3.43E-02 -3.59E-02 -3.60E-02 60 -3.39E-02 -3.68E-02 -3.61E-02 -3.41E-02 -3.37E-02 -3.41E-02 -3.63E-02 -3.76E-02 -3.46E-02 -3.62E-02 -3.60E-02 70 -3.39E-02 -3.68E-02 -3.61E-02 -3.41E-02 -3.37E-02 -3.41E-02 -3.63E-02 -3.76E-02 -3.46E-02 -3.62E-02 -3.60E-02 -3.69E-02 1.35E-03 -3.32E-02 -4.06E-02 -3.57E-02 1.42E-03 -3.18E-02 -3.96E-02 -3.52E-02 1.42E-03 -3.13E-02 -3.91E-02 -3.50E-02 1.43E-03 -3.11E-02 -3.89E-02 -3.42E-02 1.43E-03 -3.02E-02 -3.81E-02 -3.49E-02 1.41E-03 -3.10E-02 -3.88E-02 -3.49E-02 1.41E-03 -3.10E-02 -3.88E-02 -3.75E-02 1.37E-03 -3.37E-02 -4.13E-02 -1.50E-02 PASS -3.66E-02 1.38E-03 -3.28E-02 -4.04E-02 -1.00E-02 PASS -3.62E-02 1.39E-03 -3.24E-02 -4.00E-02 -1.00E-02 PASS -3.59E-02 1.39E-03 -3.21E-02 -3.98E-02 -1.00E-02 PASS -3.54E-02 1.43E-03 -3.15E-02 -3.93E-02 -1.00E-02 PASS -3.57E-02 1.43E-03 -3.18E-02 -3.96E-02 -1.00E-02 PASS -3.57E-02 1.43E-03 -3.18E-02 -3.96E-02 -1.00E-02 PASS An ISO 9001:2000 Certified Company 204 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Short-Circuit Current @ +/- 15 V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.99. Plot of Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 205 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.99. Raw data for Negative Short-Circuit Current @ +/- 15 V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ +/- 15 V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.76E-02 5.05E-02 5.09E-02 5.04E-02 5.01E-02 4.92E-02 5.05E-02 5.06E-02 4.98E-02 5.04E-02 4.98E-02 10 4.84E-02 4.99E-02 5.05E-02 5.02E-02 4.98E-02 4.94E-02 5.08E-02 5.08E-02 5.01E-02 5.08E-02 5.02E-02 20 4.83E-02 4.98E-02 5.04E-02 5.00E-02 4.97E-02 4.92E-02 5.07E-02 5.07E-02 5.01E-02 5.07E-02 5.03E-02 30 4.79E-02 4.93E-02 4.99E-02 4.98E-02 4.93E-02 4.92E-02 5.06E-02 5.07E-02 4.99E-02 5.05E-02 5.01E-02 50 4.82E-02 4.95E-02 5.00E-02 4.99E-02 4.94E-02 4.91E-02 5.05E-02 5.05E-02 4.98E-02 5.04E-02 5.00E-02 60 4.71E-02 4.83E-02 4.90E-02 4.87E-02 4.83E-02 4.86E-02 5.00E-02 5.01E-02 4.94E-02 5.00E-02 5.01E-02 70 4.71E-02 4.83E-02 4.90E-02 4.87E-02 4.83E-02 4.86E-02 5.00E-02 5.01E-02 4.94E-02 5.00E-02 5.01E-02 4.99E-02 1.30E-03 5.34E-02 4.63E-02 4.98E-02 7.82E-04 5.19E-02 4.76E-02 4.96E-02 7.83E-04 5.18E-02 4.75E-02 4.92E-02 7.84E-04 5.14E-02 4.71E-02 4.94E-02 7.41E-04 5.14E-02 4.73E-02 4.83E-02 7.08E-04 5.02E-02 4.63E-02 4.83E-02 7.08E-04 5.02E-02 4.63E-02 5.01E-02 5.95E-04 5.17E-02 4.84E-02 1.50E-02 PASS 5.04E-02 6.32E-04 5.21E-02 4.86E-02 1.00E-02 PASS 5.03E-02 6.49E-04 5.21E-02 4.85E-02 1.00E-02 PASS 5.02E-02 6.43E-04 5.19E-02 4.84E-02 1.00E-02 PASS 5.01E-02 6.09E-04 5.17E-02 4.84E-02 1.00E-02 PASS 4.96E-02 6.25E-04 5.13E-02 4.79E-02 1.00E-02 PASS 4.96E-02 6.25E-04 5.13E-02 4.79E-02 1.00E-02 PASS An ISO 9001:2000 Certified Company 206 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Short-Circuit Current @ +/- 15 V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.100. Plot of Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 207 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.100. Raw data for Negative Short-Circuit Current @ +/- 15 V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ +/- 15 V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.70E-02 4.89E-02 5.03E-02 4.76E-02 4.80E-02 5.07E-02 4.90E-02 4.89E-02 4.92E-02 5.04E-02 5.00E-02 10 4.76E-02 4.83E-02 4.99E-02 4.76E-02 4.76E-02 5.09E-02 4.92E-02 4.91E-02 4.96E-02 5.07E-02 5.05E-02 20 4.75E-02 4.82E-02 4.97E-02 4.74E-02 4.74E-02 5.08E-02 4.92E-02 4.91E-02 4.95E-02 5.06E-02 5.05E-02 30 4.73E-02 4.77E-02 4.93E-02 4.71E-02 4.73E-02 5.07E-02 4.90E-02 4.90E-02 4.93E-02 5.05E-02 5.04E-02 50 4.76E-02 4.79E-02 4.94E-02 4.72E-02 4.74E-02 5.07E-02 4.89E-02 4.88E-02 4.92E-02 5.03E-02 5.03E-02 60 4.64E-02 4.70E-02 4.84E-02 4.61E-02 4.64E-02 5.01E-02 4.84E-02 4.83E-02 4.88E-02 4.99E-02 5.03E-02 70 4.64E-02 4.70E-02 4.84E-02 4.61E-02 4.64E-02 5.01E-02 4.84E-02 4.83E-02 4.88E-02 4.99E-02 5.03E-02 4.83E-02 1.28E-03 5.18E-02 4.48E-02 4.82E-02 9.85E-04 5.09E-02 4.55E-02 4.81E-02 9.90E-04 5.08E-02 4.54E-02 4.78E-02 8.93E-04 5.02E-02 4.53E-02 4.79E-02 9.05E-04 5.04E-02 4.54E-02 4.69E-02 9.34E-04 4.94E-02 4.43E-02 4.69E-02 9.34E-04 4.94E-02 4.43E-02 4.96E-02 8.42E-04 5.19E-02 4.73E-02 1.50E-02 PASS 4.99E-02 8.33E-04 5.22E-02 4.76E-02 1.00E-02 PASS 4.98E-02 8.27E-04 5.21E-02 4.76E-02 1.00E-02 PASS 4.97E-02 8.41E-04 5.20E-02 4.74E-02 1.00E-02 PASS 4.96E-02 8.68E-04 5.20E-02 4.72E-02 1.00E-02 PASS 4.91E-02 8.37E-04 5.14E-02 4.68E-02 1.00E-02 PASS 4.91E-02 8.37E-04 5.14E-02 4.68E-02 1.00E-02 PASS An ISO 9001:2000 Certified Company 208 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Short-Circuit Current @ +/- 15 V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.101. Plot of Negative Short-Circuit Current @ +/- 15 V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 209 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.101. Raw data for Negative Short-Circuit Current @ +/- 15 V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ +/- 15 V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.71E-02 4.88E-02 5.00E-02 4.76E-02 4.79E-02 5.06E-02 4.92E-02 4.89E-02 4.92E-02 5.04E-02 5.01E-02 10 4.77E-02 4.83E-02 4.97E-02 4.77E-02 4.76E-02 5.09E-02 4.95E-02 4.91E-02 4.95E-02 5.08E-02 5.06E-02 20 4.76E-02 4.81E-02 4.95E-02 4.75E-02 4.75E-02 5.07E-02 4.94E-02 4.90E-02 4.94E-02 5.07E-02 5.06E-02 30 4.74E-02 4.77E-02 4.90E-02 4.72E-02 4.73E-02 5.06E-02 4.93E-02 4.89E-02 4.93E-02 5.06E-02 5.05E-02 50 4.76E-02 4.78E-02 4.92E-02 4.73E-02 4.73E-02 5.06E-02 4.92E-02 4.88E-02 4.92E-02 5.04E-02 5.04E-02 60 4.65E-02 4.70E-02 4.82E-02 4.61E-02 4.63E-02 5.01E-02 4.87E-02 4.83E-02 4.88E-02 5.00E-02 5.04E-02 70 4.65E-02 4.70E-02 4.82E-02 4.61E-02 4.63E-02 5.01E-02 4.87E-02 4.83E-02 4.88E-02 5.00E-02 5.04E-02 4.83E-02 1.15E-03 5.14E-02 4.51E-02 4.82E-02 8.63E-04 5.06E-02 4.58E-02 4.80E-02 8.68E-04 5.04E-02 4.57E-02 4.77E-02 7.69E-04 4.98E-02 4.56E-02 4.78E-02 7.97E-04 5.00E-02 4.56E-02 4.68E-02 8.34E-04 4.91E-02 4.45E-02 4.68E-02 8.34E-04 4.91E-02 4.45E-02 4.97E-02 8.09E-04 5.19E-02 4.74E-02 1.50E-02 PASS 4.99E-02 8.19E-04 5.22E-02 4.77E-02 1.00E-02 PASS 4.98E-02 8.10E-04 5.21E-02 4.76E-02 1.00E-02 PASS 4.97E-02 7.92E-04 5.19E-02 4.76E-02 1.00E-02 PASS 4.96E-02 8.15E-04 5.19E-02 4.74E-02 1.00E-02 PASS 4.92E-02 8.13E-04 5.14E-02 4.69E-02 1.00E-02 PASS 4.92E-02 8.13E-04 5.14E-02 4.69E-02 1.00E-02 PASS An ISO 9001:2000 Certified Company 210 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Short-Circuit Current @ +/- 15 V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.102. Plot of Negative Short-Circuit Current @ +/- 15 V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 211 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.102. Raw data for Negative Short-Circuit Current @ +/- 15 V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ +/- 15 V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.62E-02 4.88E-02 4.93E-02 4.84E-02 4.83E-02 4.76E-02 4.89E-02 4.90E-02 4.82E-02 4.86E-02 4.80E-02 10 4.70E-02 4.83E-02 4.89E-02 4.83E-02 4.80E-02 4.78E-02 4.92E-02 4.92E-02 4.85E-02 4.89E-02 4.85E-02 20 4.69E-02 4.81E-02 4.88E-02 4.82E-02 4.79E-02 4.76E-02 4.91E-02 4.91E-02 4.85E-02 4.88E-02 4.86E-02 30 4.65E-02 4.77E-02 4.84E-02 4.79E-02 4.76E-02 4.75E-02 4.90E-02 4.91E-02 4.83E-02 4.87E-02 4.84E-02 50 4.67E-02 4.78E-02 4.85E-02 4.80E-02 4.76E-02 4.75E-02 4.89E-02 4.90E-02 4.82E-02 4.85E-02 4.83E-02 60 4.57E-02 4.70E-02 4.75E-02 4.71E-02 4.68E-02 4.72E-02 4.84E-02 4.85E-02 4.78E-02 4.81E-02 4.84E-02 70 4.57E-02 4.70E-02 4.75E-02 4.71E-02 4.68E-02 4.72E-02 4.84E-02 4.85E-02 4.78E-02 4.81E-02 4.84E-02 4.82E-02 1.17E-03 5.14E-02 4.50E-02 4.81E-02 7.11E-04 5.01E-02 4.62E-02 4.80E-02 7.05E-04 4.99E-02 4.60E-02 4.76E-02 6.71E-04 4.94E-02 4.58E-02 4.77E-02 6.49E-04 4.95E-02 4.59E-02 4.68E-02 6.93E-04 4.87E-02 4.49E-02 4.68E-02 6.93E-04 4.87E-02 4.49E-02 4.84E-02 5.78E-04 5.00E-02 4.69E-02 1.50E-02 PASS 4.87E-02 6.08E-04 5.04E-02 4.70E-02 1.00E-02 PASS 4.86E-02 6.20E-04 5.03E-02 4.69E-02 1.00E-02 PASS 4.85E-02 6.25E-04 5.02E-02 4.68E-02 1.00E-02 PASS 4.84E-02 5.86E-04 5.00E-02 4.68E-02 1.00E-02 PASS 4.80E-02 5.16E-04 4.94E-02 4.66E-02 1.00E-02 PASS 4.80E-02 5.16E-04 4.94E-02 4.66E-02 1.00E-02 PASS An ISO 9001:2000 Certified Company 212 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.00E-02 Positive Supply Current @ 3V (A) 9.50E-03 9.00E-03 8.50E-03 8.00E-03 7.50E-03 7.00E-03 6.50E-03 6.00E-03 5.50E-03 5.00E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.103. Plot of Positive Supply Current @ 3V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 213 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.103. Raw data for Positive Supply Current @ 3V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @ 3V (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.38E-03 7.54E-03 7.47E-03 7.34E-03 7.46E-03 7.47E-03 7.50E-03 7.67E-03 7.28E-03 7.60E-03 7.59E-03 10 7.10E-03 7.20E-03 7.16E-03 7.04E-03 7.12E-03 7.38E-03 7.41E-03 7.56E-03 7.16E-03 7.51E-03 7.58E-03 20 7.14E-03 7.31E-03 7.27E-03 7.14E-03 7.23E-03 7.40E-03 7.43E-03 7.58E-03 7.18E-03 7.51E-03 7.56E-03 30 7.10E-03 7.20E-03 7.16E-03 7.04E-03 7.12E-03 7.38E-03 7.41E-03 7.56E-03 7.16E-03 7.51E-03 7.58E-03 50 6.65E-03 6.82E-03 6.77E-03 6.62E-03 6.72E-03 7.35E-03 7.37E-03 7.53E-03 7.13E-03 7.47E-03 7.58E-03 60 6.69E-03 6.86E-03 6.81E-03 6.65E-03 6.75E-03 7.37E-03 7.40E-03 7.55E-03 7.15E-03 7.50E-03 7.59E-03 70 7.14E-03 7.32E-03 7.27E-03 7.13E-03 7.23E-03 7.36E-03 7.40E-03 7.55E-03 7.15E-03 7.49E-03 7.57E-03 7.44E-03 7.89E-05 7.65E-03 7.22E-03 7.12E-03 6.07E-05 7.29E-03 6.96E-03 7.22E-03 7.66E-05 7.43E-03 7.01E-03 7.12E-03 6.07E-05 7.29E-03 6.96E-03 6.72E-03 8.26E-05 6.94E-03 6.49E-03 6.75E-03 8.56E-05 6.99E-03 6.52E-03 7.22E-03 8.23E-05 7.44E-03 6.99E-03 7.50E-03 1.48E-04 7.91E-03 7.10E-03 8.80E-03 PASS 7.40E-03 1.55E-04 7.83E-03 6.98E-03 8.80E-03 PASS 7.42E-03 1.51E-04 7.84E-03 7.00E-03 8.80E-03 PASS 7.40E-03 1.55E-04 7.83E-03 6.98E-03 8.80E-03 PASS 7.37E-03 1.53E-04 7.79E-03 6.95E-03 8.80E-03 PASS 7.39E-03 1.55E-04 7.82E-03 6.97E-03 8.80E-03 PASS 7.39E-03 1.53E-04 7.81E-03 6.97E-03 8.80E-03 PASS An ISO 9001:2000 Certified Company 214 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased -5.00E-03 Negative Supply Current @ 3V (A) -5.50E-03 -6.00E-03 -6.50E-03 -7.00E-03 -7.50E-03 -8.00E-03 -8.50E-03 -9.00E-03 -9.50E-03 -1.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.104. Plot of Negative Supply Current @ 3V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 215 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.104. Raw data for Negative Supply Current @ 3V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @ 3V (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -7.38E-03 -7.53E-03 -7.46E-03 -7.34E-03 -7.45E-03 -7.47E-03 -7.49E-03 -7.66E-03 -7.27E-03 -7.59E-03 -7.59E-03 10 -7.10E-03 -7.20E-03 -7.15E-03 -7.04E-03 -7.12E-03 -7.37E-03 -7.41E-03 -7.55E-03 -7.16E-03 -7.50E-03 -7.57E-03 20 -7.13E-03 -7.31E-03 -7.27E-03 -7.13E-03 -7.22E-03 -7.39E-03 -7.42E-03 -7.57E-03 -7.18E-03 -7.51E-03 -7.56E-03 30 -7.10E-03 -7.20E-03 -7.15E-03 -7.04E-03 -7.12E-03 -7.37E-03 -7.41E-03 -7.55E-03 -7.16E-03 -7.50E-03 -7.57E-03 50 -6.65E-03 -6.81E-03 -6.76E-03 -6.61E-03 -6.71E-03 -7.35E-03 -7.37E-03 -7.52E-03 -7.12E-03 -7.47E-03 -7.57E-03 60 -6.69E-03 -6.85E-03 -6.80E-03 -6.65E-03 -6.75E-03 -7.37E-03 -7.39E-03 -7.55E-03 -7.14E-03 -7.49E-03 -7.59E-03 70 -7.13E-03 -7.31E-03 -7.27E-03 -7.12E-03 -7.23E-03 -7.36E-03 -7.40E-03 -7.54E-03 -7.15E-03 -7.48E-03 -7.57E-03 -7.43E-03 7.40E-05 -7.23E-03 -7.63E-03 -7.12E-03 5.93E-05 -6.96E-03 -7.28E-03 -7.21E-03 8.14E-05 -6.99E-03 -7.44E-03 -7.12E-03 5.93E-05 -6.96E-03 -7.28E-03 -6.71E-03 8.07E-05 -6.49E-03 -6.93E-03 -6.75E-03 8.07E-05 -6.53E-03 -6.97E-03 -7.21E-03 8.44E-05 -6.98E-03 -7.44E-03 -7.50E-03 1.48E-04 -7.09E-03 -7.90E-03 -8.80E-03 PASS -7.40E-03 1.51E-04 -6.98E-03 -7.81E-03 -8.80E-03 PASS -7.41E-03 1.49E-04 -7.01E-03 -7.82E-03 -8.80E-03 PASS -7.40E-03 1.51E-04 -6.98E-03 -7.81E-03 -8.80E-03 PASS -7.37E-03 1.54E-04 -6.94E-03 -7.79E-03 -8.80E-03 PASS -7.39E-03 1.57E-04 -6.96E-03 -7.82E-03 -8.80E-03 PASS -7.39E-03 1.49E-04 -6.98E-03 -7.80E-03 -8.80E-03 PASS An ISO 9001:2000 Certified Company 216 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 3V, VCM=0V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.105. Plot of Input Offset Voltage @ 3V, VCM=0V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 217 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.105. Raw data for Input Offset Voltage @ 3V, VCM=0V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=0V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.22E-04 1.53E-04 -1.24E-04 6.53E-05 -9.53E-05 -1.07E-04 -3.33E-04 7.22E-05 -3.67E-05 -7.96E-05 -2.92E-04 10 -3.00E-04 1.11E-04 -1.43E-04 6.28E-05 -1.05E-04 -1.19E-04 -3.45E-04 5.03E-05 -4.83E-05 -8.76E-05 -2.95E-04 20 -3.07E-04 1.16E-04 -1.42E-04 6.18E-05 -1.14E-04 -1.15E-04 -3.45E-04 5.09E-05 -4.78E-05 -9.04E-05 -2.96E-04 30 -3.00E-04 1.11E-04 -1.43E-04 6.28E-05 -1.05E-04 -1.19E-04 -3.45E-04 5.03E-05 -4.83E-05 -8.76E-05 -2.95E-04 50 -2.87E-04 1.09E-04 -1.48E-04 7.75E-05 -1.02E-04 -1.18E-04 -3.44E-04 5.13E-05 -4.90E-05 -8.77E-05 -2.96E-04 60 -2.88E-04 1.12E-04 -1.46E-04 8.14E-05 -9.88E-05 -1.19E-04 -3.43E-04 5.35E-05 -4.88E-05 -8.66E-05 -2.95E-04 70 -3.01E-04 9.57E-05 -1.54E-04 6.36E-05 -9.49E-05 -1.24E-04 -3.55E-04 5.47E-05 -5.31E-05 -9.72E-05 -2.95E-04 -6.46E-05 1.84E-04 4.39E-04 -5.68E-04 -7.47E-05 1.66E-04 3.80E-04 -5.29E-04 -7.71E-05 1.70E-04 3.88E-04 -5.42E-04 -7.47E-05 1.66E-04 3.80E-04 -5.29E-04 -7.00E-05 1.64E-04 3.81E-04 -5.21E-04 -6.79E-05 1.66E-04 3.88E-04 -5.23E-04 -7.82E-05 1.63E-04 3.68E-04 -5.24E-04 -9.68E-05 1.49E-04 3.11E-04 -5.05E-04 -8.00E-04 PASS 8.00E-04 PASS -1.10E-04 1.46E-04 2.91E-04 -5.10E-04 -9.50E-04 PASS 9.50E-04 PASS -1.10E-04 1.46E-04 2.91E-04 -5.10E-04 -9.50E-04 PASS 9.50E-04 PASS -1.10E-04 1.46E-04 2.91E-04 -5.10E-04 -9.50E-04 PASS 9.50E-04 PASS -1.09E-04 1.46E-04 2.90E-04 -5.09E-04 -9.50E-04 PASS 9.50E-04 PASS -1.09E-04 1.46E-04 2.92E-04 -5.09E-04 -9.50E-04 PASS 9.50E-04 PASS -1.15E-04 1.50E-04 2.98E-04 -5.28E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 218 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 3V, VCM=0V #2 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.106. Plot of Input Offset Voltage @ 3V, VCM=0V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 219 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.106. Raw data for Input Offset Voltage @ 3V, VCM=0V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=0V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.52E-04 4.28E-05 1.11E-04 2.02E-05 1.92E-04 7.45E-05 7.65E-06 -1.05E-04 -1.74E-04 -4.89E-05 -1.72E-04 10 2.45E-04 3.37E-05 1.03E-04 2.72E-05 1.58E-04 5.80E-05 2.57E-06 -1.15E-04 -1.72E-04 -6.51E-05 -1.76E-04 20 2.43E-04 3.18E-05 1.02E-04 2.30E-05 1.55E-04 5.98E-05 2.09E-06 -1.14E-04 -1.73E-04 -6.65E-05 -1.78E-04 30 2.45E-04 3.37E-05 1.03E-04 2.72E-05 1.58E-04 5.80E-05 2.57E-06 -1.15E-04 -1.72E-04 -6.51E-05 -1.76E-04 50 2.55E-04 4.62E-05 1.16E-04 4.50E-05 1.65E-04 5.79E-05 5.20E-07 -1.17E-04 -1.81E-04 -7.04E-05 -1.75E-04 60 2.60E-04 4.82E-05 1.18E-04 5.02E-05 1.74E-04 6.14E-05 2.93E-06 -1.16E-04 -1.77E-04 -6.70E-05 -1.75E-04 70 2.47E-04 5.22E-05 7.20E-05 8.73E-06 1.78E-04 6.10E-05 -4.55E-06 -1.08E-04 -1.82E-04 -5.93E-05 -1.75E-04 1.24E-04 9.80E-05 3.92E-04 -1.45E-04 1.13E-04 9.12E-05 3.63E-04 -1.37E-04 1.11E-04 9.15E-05 3.62E-04 -1.40E-04 1.13E-04 9.12E-05 3.63E-04 -1.37E-04 1.25E-04 8.82E-05 3.67E-04 -1.17E-04 1.30E-04 8.96E-05 3.76E-04 -1.15E-04 1.12E-04 9.79E-05 3.80E-04 -1.57E-04 -4.93E-05 9.66E-05 2.16E-04 -3.14E-04 -8.00E-04 PASS 8.00E-04 PASS -5.84E-05 9.15E-05 1.93E-04 -3.09E-04 -9.50E-04 PASS 9.50E-04 PASS -5.83E-05 9.21E-05 1.94E-04 -3.11E-04 -9.50E-04 PASS 9.50E-04 PASS -5.84E-05 9.15E-05 1.93E-04 -3.09E-04 -9.50E-04 PASS 9.50E-04 PASS -6.21E-05 9.44E-05 1.97E-04 -3.21E-04 -9.50E-04 PASS 9.50E-04 PASS -5.90E-05 9.42E-05 1.99E-04 -3.17E-04 -9.50E-04 PASS 9.50E-04 PASS -5.86E-05 9.34E-05 1.97E-04 -3.15E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 220 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 3V, VCM=0V #3 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.107. Plot of Input Offset Voltage @ 3V, VCM=0V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 221 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.107. Raw data for Input Offset Voltage @ 3V, VCM=0V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=0V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.17E-05 -1.73E-04 -1.89E-04 1.25E-05 -1.53E-05 -5.99E-06 -2.24E-05 -1.65E-04 -2.93E-04 -5.84E-05 -2.17E-04 10 -6.37E-05 -2.13E-04 -1.81E-04 -2.76E-05 -3.12E-05 -2.62E-05 -3.44E-05 -1.74E-04 -3.03E-04 -6.59E-05 -2.17E-04 20 -6.57E-05 -2.12E-04 -1.87E-04 -2.93E-05 -3.86E-05 -2.47E-05 -3.54E-05 -1.76E-04 -3.02E-04 -6.76E-05 -2.18E-04 30 -6.37E-05 -2.13E-04 -1.81E-04 -2.76E-05 -3.12E-05 -2.62E-05 -3.44E-05 -1.74E-04 -3.03E-04 -6.59E-05 -2.17E-04 50 -7.23E-05 -2.20E-04 -1.60E-04 -1.95E-05 -3.42E-05 -2.79E-05 -3.42E-05 -1.73E-04 -3.01E-04 -6.22E-05 -2.21E-04 60 -6.98E-05 -2.14E-04 -1.55E-04 -1.91E-05 -3.08E-05 -2.52E-05 -3.19E-05 -1.71E-04 -2.99E-04 -6.19E-05 -2.19E-04 70 -9.53E-05 -2.05E-04 -1.96E-04 -2.98E-05 -4.44E-05 -1.08E-05 -4.65E-05 -1.72E-04 -3.02E-04 -6.54E-05 -2.20E-04 -7.92E-05 9.42E-05 1.79E-04 -3.38E-04 -1.04E-04 8.77E-05 1.37E-04 -3.44E-04 -1.07E-04 8.65E-05 1.31E-04 -3.44E-04 -1.04E-04 8.77E-05 1.37E-04 -3.44E-04 -1.01E-04 8.59E-05 1.34E-04 -3.37E-04 -9.78E-05 8.41E-05 1.33E-04 -3.28E-04 -1.14E-04 8.26E-05 1.12E-04 -3.41E-04 -1.09E-04 1.20E-04 2.20E-04 -4.38E-04 -8.00E-04 PASS 8.00E-04 PASS -1.21E-04 1.18E-04 2.02E-04 -4.43E-04 -9.50E-04 PASS 9.50E-04 PASS -1.21E-04 1.18E-04 2.01E-04 -4.43E-04 -9.50E-04 PASS 9.50E-04 PASS -1.21E-04 1.18E-04 2.02E-04 -4.43E-04 -9.50E-04 PASS 9.50E-04 PASS -1.20E-04 1.17E-04 2.01E-04 -4.40E-04 -9.50E-04 PASS 9.50E-04 PASS -1.18E-04 1.17E-04 2.03E-04 -4.38E-04 -9.50E-04 PASS 9.50E-04 PASS -1.19E-04 1.19E-04 2.06E-04 -4.44E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 222 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Voltage @ 3V, VCM=0V #4 (V) 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.108. Plot of Input Offset Voltage @ 3V, VCM=0V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 223 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.108. Raw data for Input Offset Voltage @ 3V, VCM=0V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=0V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -8.06E-05 2.02E-04 -3.29E-04 1.14E-05 -1.55E-04 -4.42E-06 -1.80E-04 -2.84E-04 1.30E-04 -4.40E-05 -4.51E-05 10 -7.77E-05 1.83E-04 -3.41E-04 -1.17E-06 -1.60E-04 -1.64E-05 -1.82E-04 -2.98E-04 1.16E-04 -4.69E-05 -4.62E-05 20 -8.66E-05 1.82E-04 -3.43E-04 -3.46E-06 -1.67E-04 -1.49E-05 -1.82E-04 -2.95E-04 1.14E-04 -4.71E-05 -5.02E-05 30 -7.77E-05 1.83E-04 -3.41E-04 -1.17E-06 -1.60E-04 -1.64E-05 -1.82E-04 -2.98E-04 1.16E-04 -4.69E-05 -4.62E-05 50 -6.31E-05 1.91E-04 -3.45E-04 4.75E-06 -1.51E-04 -1.83E-05 -1.84E-04 -2.95E-04 1.15E-04 -4.85E-05 -4.85E-05 60 -6.00E-05 1.98E-04 -3.44E-04 5.23E-06 -1.50E-04 -1.70E-05 -1.82E-04 -2.94E-04 1.19E-04 -4.82E-05 -4.66E-05 70 -8.69E-05 1.73E-04 -3.63E-04 9.46E-06 -1.59E-04 -1.71E-05 -2.03E-04 -3.01E-04 1.04E-04 -4.56E-05 -4.97E-05 -7.03E-05 1.97E-04 4.69E-04 -6.10E-04 -7.95E-05 1.93E-04 4.51E-04 -6.10E-04 -8.35E-05 1.94E-04 4.50E-04 -6.17E-04 -7.95E-05 1.93E-04 4.51E-04 -6.10E-04 -7.27E-05 1.98E-04 4.69E-04 -6.14E-04 -7.03E-05 1.99E-04 4.76E-04 -6.17E-04 -8.53E-05 1.99E-04 4.60E-04 -6.30E-04 -7.65E-05 1.60E-04 3.62E-04 -5.15E-04 -8.00E-04 PASS 8.00E-04 PASS -8.54E-05 1.59E-04 3.51E-04 -5.21E-04 -9.50E-04 PASS 9.50E-04 PASS -8.51E-05 1.58E-04 3.48E-04 -5.18E-04 -9.50E-04 PASS 9.50E-04 PASS -8.54E-05 1.59E-04 3.51E-04 -5.21E-04 -9.50E-04 PASS 9.50E-04 PASS -8.62E-05 1.58E-04 3.47E-04 -5.19E-04 -9.50E-04 PASS 9.50E-04 PASS -8.44E-05 1.59E-04 3.51E-04 -5.20E-04 -9.50E-04 PASS 9.50E-04 PASS -9.24E-05 1.60E-04 3.46E-04 -5.30E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 224 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 3V, VCM=0V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.109. Plot of Input Offset Current @ 3V, VCM=0V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 225 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.109. Raw data for Input Offset Current @ 3V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=0V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.62E-10 7.59E-09 2.21E-10 4.79E-09 2.83E-10 -3.41E-09 5.04E-10 -6.32E-10 -3.51E-09 -2.54E-09 -6.24E-10 10 2.35E-10 6.49E-09 -2.08E-10 4.10E-09 -8.50E-11 -3.35E-09 -5.00E-10 -8.54E-10 -3.00E-09 -3.22E-09 -6.53E-10 20 1.63E-10 7.16E-09 -4.46E-10 4.15E-09 2.00E-12 -3.46E-09 -1.10E-11 -1.17E-09 -2.74E-09 -2.67E-09 -6.20E-10 30 2.35E-10 6.49E-09 -2.08E-10 4.10E-09 -8.50E-11 -3.35E-09 -5.00E-10 -8.54E-10 -3.00E-09 -3.22E-09 -6.53E-10 50 9.12E-10 6.32E-09 -6.59E-10 3.96E-09 -2.10E-11 -3.50E-09 3.17E-10 -5.65E-10 -3.04E-09 -3.12E-09 -6.47E-10 60 8.49E-10 6.16E-09 -6.26E-10 3.96E-09 -1.22E-10 -3.59E-09 1.00E-12 -6.62E-10 -2.65E-09 -3.48E-09 -6.67E-10 70 1.23E-10 6.07E-09 -9.60E-10 4.21E-09 1.83E-10 -4.08E-09 -4.28E-10 -8.13E-10 -3.11E-09 -3.26E-09 -5.97E-10 2.67E-09 3.36E-09 1.19E-08 -6.55E-09 2.11E-09 3.04E-09 1.04E-08 -6.22E-09 2.20E-09 3.33E-09 1.13E-08 -6.92E-09 2.11E-09 3.04E-09 1.04E-08 -6.22E-09 2.10E-09 2.95E-09 1.02E-08 -5.98E-09 2.04E-09 2.91E-09 1.00E-08 -5.94E-09 1.92E-09 3.04E-09 1.03E-08 -6.41E-09 -1.92E-09 1.78E-09 2.96E-09 -6.79E-09 -6.50E-08 PASS 6.50E-08 PASS -2.19E-09 1.39E-09 1.62E-09 -5.99E-09 -6.50E-08 PASS 6.50E-08 PASS -2.01E-09 1.39E-09 1.81E-09 -5.83E-09 -6.50E-08 PASS 6.50E-08 PASS -2.19E-09 1.39E-09 1.62E-09 -5.99E-09 -6.50E-08 PASS 6.50E-08 PASS -1.98E-09 1.73E-09 2.77E-09 -6.73E-09 -6.50E-08 PASS 6.50E-08 PASS -2.08E-09 1.65E-09 2.45E-09 -6.61E-09 -6.50E-08 PASS 6.50E-08 PASS -2.34E-09 1.62E-09 2.10E-09 -6.78E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 226 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 3V, VCM=0V #2 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.110. Plot of Input Offset Current @ 3V, VCM=0V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 227 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.110. Raw data for Input Offset Current @ 3V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=0V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.12E-08 2.70E-10 1.19E-09 5.62E-09 1.56E-09 1.34E-09 2.11E-09 4.10E-09 -1.64E-09 1.14E-09 -5.12E-09 10 -1.03E-08 2.70E-10 7.02E-10 5.47E-09 1.58E-09 1.85E-09 1.90E-09 4.07E-09 -1.64E-09 1.48E-09 -5.24E-09 20 -1.08E-08 2.51E-10 7.09E-10 5.29E-09 1.03E-09 2.02E-09 1.90E-09 3.92E-09 -1.80E-09 1.36E-09 -5.28E-09 30 -1.03E-08 2.70E-10 7.02E-10 5.47E-09 1.58E-09 1.85E-09 1.90E-09 4.07E-09 -1.64E-09 1.48E-09 -5.24E-09 50 -1.08E-08 -4.60E-11 4.36E-10 5.10E-09 1.51E-09 1.30E-09 1.08E-09 4.14E-09 -1.25E-09 1.37E-09 -5.23E-09 60 -1.05E-08 2.08E-10 2.64E-10 5.10E-09 1.71E-09 1.55E-09 9.99E-10 4.04E-09 -1.25E-09 1.59E-09 -5.21E-09 70 -1.09E-08 2.85E-10 3.17E-10 5.65E-09 1.37E-09 1.41E-09 1.69E-09 3.89E-09 -1.45E-09 1.17E-09 -5.14E-09 -5.04E-10 6.30E-09 1.68E-08 -1.78E-08 -4.64E-10 5.89E-09 1.57E-08 -1.66E-08 -7.02E-10 5.99E-09 1.57E-08 -1.71E-08 -4.64E-10 5.89E-09 1.57E-08 -1.66E-08 -7.55E-10 5.95E-09 1.56E-08 -1.71E-08 -6.40E-10 5.85E-09 1.54E-08 -1.67E-08 -6.64E-10 6.15E-09 1.62E-08 -1.75E-08 1.41E-09 2.07E-09 7.08E-09 -4.26E-09 -6.50E-08 PASS 6.50E-08 PASS 1.53E-09 2.04E-09 7.13E-09 -4.07E-09 -6.50E-08 PASS 6.50E-08 PASS 1.48E-09 2.07E-09 7.16E-09 -4.20E-09 -6.50E-08 PASS 6.50E-08 PASS 1.53E-09 2.04E-09 7.13E-09 -4.07E-09 -6.50E-08 PASS 6.50E-08 PASS 1.33E-09 1.91E-09 6.57E-09 -3.92E-09 -6.50E-08 PASS 6.50E-08 PASS 1.39E-09 1.88E-09 6.55E-09 -3.78E-09 -6.50E-08 PASS 6.50E-08 PASS 1.34E-09 1.90E-09 6.55E-09 -3.87E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 228 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 3V, VCM=0V #3 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.111. Plot of Input Offset Current @ 3V, VCM=0V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 229 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.111. Raw data for Input Offset Current @ 3V, VCM=0V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=0V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.72E-10 -7.66E-10 4.63E-09 -1.01E-09 -2.82E-09 -4.11E-09 -3.33E-09 2.81E-09 2.94E-10 3.23E-09 2.44E-09 10 -8.88E-10 -6.57E-10 4.85E-09 -2.36E-09 -2.30E-09 -3.85E-09 -3.20E-09 3.84E-09 7.33E-10 3.36E-09 2.47E-09 20 -9.61E-10 -1.05E-09 4.77E-09 -2.41E-09 -2.40E-09 -3.94E-09 -3.23E-09 2.90E-09 4.75E-10 2.90E-09 2.45E-09 30 -8.88E-10 -6.57E-10 4.85E-09 -2.36E-09 -2.30E-09 -3.85E-09 -3.20E-09 3.84E-09 7.33E-10 3.36E-09 2.47E-09 50 -6.91E-10 -1.20E-09 4.73E-09 -2.52E-09 -2.32E-09 -3.06E-09 -3.25E-09 4.06E-09 1.20E-09 2.80E-09 2.45E-09 60 -7.22E-10 -8.94E-10 4.76E-09 -2.57E-09 -2.33E-09 -3.06E-09 -3.01E-09 3.58E-09 1.02E-09 2.93E-09 2.47E-09 70 -3.41E-10 -6.61E-10 5.13E-09 -1.69E-09 -3.01E-09 -3.77E-09 -3.24E-09 3.18E-09 8.65E-10 3.22E-09 2.50E-09 -6.54E-11 2.79E-09 7.58E-09 -7.71E-09 -2.72E-10 2.97E-09 7.86E-09 -8.41E-09 -4.10E-10 2.98E-09 7.76E-09 -8.58E-09 -2.72E-10 2.97E-09 7.86E-09 -8.41E-09 -4.01E-10 2.97E-09 7.73E-09 -8.53E-09 -3.51E-10 2.97E-09 7.80E-09 -8.50E-09 -1.15E-10 3.11E-09 8.42E-09 -8.65E-09 -2.19E-10 3.39E-09 9.09E-09 -9.53E-09 -6.50E-08 PASS 6.50E-08 PASS 1.78E-10 3.58E-09 1.00E-08 -9.65E-09 -6.50E-08 PASS 6.50E-08 PASS -1.78E-10 3.27E-09 8.80E-09 -9.15E-09 -6.50E-08 PASS 6.50E-08 PASS 1.78E-10 3.58E-09 1.00E-08 -9.65E-09 -6.50E-08 PASS 6.50E-08 PASS 3.49E-10 3.36E-09 9.55E-09 -8.86E-09 -6.50E-08 PASS 6.50E-08 PASS 2.90E-10 3.18E-09 9.01E-09 -8.43E-09 -6.50E-08 PASS 6.50E-08 PASS 5.34E-11 3.39E-09 9.34E-09 -9.24E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 230 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 3V, VCM=0V #4 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.112. Plot of Input Offset Current @ 3V, VCM=0V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 231 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.112. Raw data for Input Offset Current @ 3V, VCM=0V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=0V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.03E-09 3.82E-09 -4.34E-09 -1.57E-09 -1.42E-09 -1.43E-09 2.65E-09 -1.22E-08 -3.82E-09 -4.53E-09 -2.67E-10 10 -2.25E-09 4.55E-09 -4.48E-09 -1.29E-09 -1.71E-09 -1.31E-09 2.56E-09 -1.31E-08 -2.88E-09 -4.53E-09 -2.09E-10 20 -2.38E-09 4.11E-09 -4.40E-09 -1.25E-09 -1.96E-09 -1.49E-09 2.18E-09 -1.26E-08 -3.75E-09 -3.94E-09 -2.29E-10 30 -2.25E-09 4.55E-09 -4.48E-09 -1.29E-09 -1.71E-09 -1.31E-09 2.56E-09 -1.31E-08 -2.88E-09 -4.53E-09 -2.09E-10 50 -2.11E-09 4.49E-09 -3.95E-09 -5.79E-10 -2.14E-09 -1.80E-09 3.15E-09 -1.16E-08 -2.93E-09 -4.05E-09 -3.00E-10 60 -2.28E-09 4.44E-09 -4.19E-09 -5.06E-10 -2.00E-09 -1.62E-09 3.13E-09 -1.17E-08 -3.01E-09 -3.76E-09 -2.72E-10 70 -2.97E-09 4.56E-09 -3.59E-09 -1.16E-09 -1.72E-09 -1.80E-09 3.09E-09 -1.29E-08 -3.17E-09 -4.16E-09 -2.49E-10 -1.11E-09 2.99E-09 7.10E-09 -9.32E-09 -1.04E-09 3.36E-09 8.16E-09 -1.02E-08 -1.18E-09 3.18E-09 7.53E-09 -9.88E-09 -1.04E-09 3.36E-09 8.16E-09 -1.02E-08 -8.56E-10 3.22E-09 7.97E-09 -9.68E-09 -9.07E-10 3.27E-09 8.05E-09 -9.86E-09 -9.75E-10 3.24E-09 7.91E-09 -9.86E-09 -3.87E-09 5.46E-09 1.11E-08 -1.88E-08 -6.50E-08 PASS 6.50E-08 PASS -3.86E-09 5.81E-09 1.21E-08 -1.98E-08 -6.50E-08 PASS 6.50E-08 PASS -3.92E-09 5.44E-09 1.10E-08 -1.88E-08 -6.50E-08 PASS 6.50E-08 PASS -3.86E-09 5.81E-09 1.21E-08 -1.98E-08 -6.50E-08 PASS 6.50E-08 PASS -3.45E-09 5.33E-09 1.12E-08 -1.81E-08 -6.50E-08 PASS 6.50E-08 PASS -3.39E-09 5.35E-09 1.13E-08 -1.81E-08 -6.50E-08 PASS 6.50E-08 PASS -3.78E-09 5.79E-09 1.21E-08 -1.97E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 232 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=0V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.113. Plot of Positive Input Bias Current @ 3V, VCM=0V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 233 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.113. Raw data for Positive Input Bias Current @ 3V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=0V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.34E-07 -3.06E-07 -3.02E-07 -3.21E-07 -3.31E-07 -3.32E-07 -3.28E-07 -3.13E-07 -3.09E-07 -3.11E-07 -3.29E-07 10 -3.40E-07 -3.17E-07 -3.12E-07 -3.28E-07 -3.40E-07 -3.60E-07 -3.58E-07 -3.39E-07 -3.33E-07 -3.35E-07 -3.30E-07 20 -3.44E-07 -3.15E-07 -3.10E-07 -3.27E-07 -3.39E-07 -3.57E-07 -3.54E-07 -3.34E-07 -3.29E-07 -3.30E-07 -3.31E-07 30 -3.40E-07 -3.17E-07 -3.12E-07 -3.28E-07 -3.40E-07 -3.60E-07 -3.58E-07 -3.39E-07 -3.33E-07 -3.35E-07 -3.30E-07 50 -3.41E-07 -3.21E-07 -3.14E-07 -3.30E-07 -3.44E-07 -3.65E-07 -3.66E-07 -3.50E-07 -3.40E-07 -3.47E-07 -3.30E-07 60 -3.39E-07 -3.19E-07 -3.13E-07 -3.28E-07 -3.40E-07 -3.65E-07 -3.64E-07 -3.49E-07 -3.38E-07 -3.41E-07 -3.29E-07 70 -3.38E-07 -3.15E-07 -3.09E-07 -3.25E-07 -3.36E-07 -3.54E-07 -3.51E-07 -3.32E-07 -3.25E-07 -3.29E-07 -3.30E-07 -3.19E-07 1.45E-08 -2.79E-07 -3.59E-07 -3.27E-07 1.29E-08 -2.92E-07 -3.63E-07 -3.27E-07 1.47E-08 -2.87E-07 -3.67E-07 -3.27E-07 1.29E-08 -2.92E-07 -3.63E-07 -3.30E-07 1.28E-08 -2.95E-07 -3.65E-07 -3.28E-07 1.21E-08 -2.94E-07 -3.61E-07 -3.25E-07 1.28E-08 -2.90E-07 -3.60E-07 -3.19E-07 1.07E-08 -2.89E-07 -3.48E-07 -6.50E-07 PASS 6.50E-07 PASS -3.45E-07 1.31E-08 -3.09E-07 -3.81E-07 -7.00E-07 PASS 7.00E-07 PASS -3.41E-07 1.34E-08 -3.04E-07 -3.77E-07 -7.50E-07 PASS 7.50E-07 PASS -3.45E-07 1.31E-08 -3.09E-07 -3.81E-07 -7.50E-07 PASS 7.50E-07 PASS -3.53E-07 1.15E-08 -3.22E-07 -3.85E-07 -8.00E-07 PASS 8.00E-07 PASS -3.51E-07 1.27E-08 -3.16E-07 -3.86E-07 -8.00E-07 PASS 8.00E-07 PASS -3.38E-07 1.32E-08 -3.02E-07 -3.74E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 234 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=0V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.114. Plot of Positive Input Bias Current @ 3V, VCM=0V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 235 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.114. Raw data for Positive Input Bias Current @ 3V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=0V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.30E-07 -3.17E-07 -3.14E-07 -3.14E-07 -3.21E-07 -3.03E-07 -3.30E-07 -3.26E-07 -3.11E-07 -3.13E-07 -3.11E-07 10 -3.34E-07 -3.26E-07 -3.22E-07 -3.20E-07 -3.29E-07 -3.26E-07 -3.55E-07 -3.54E-07 -3.35E-07 -3.38E-07 -3.12E-07 20 -3.36E-07 -3.25E-07 -3.21E-07 -3.19E-07 -3.28E-07 -3.21E-07 -3.52E-07 -3.51E-07 -3.30E-07 -3.34E-07 -3.12E-07 30 -3.34E-07 -3.26E-07 -3.22E-07 -3.20E-07 -3.29E-07 -3.26E-07 -3.55E-07 -3.54E-07 -3.35E-07 -3.38E-07 -3.12E-07 50 -3.35E-07 -3.28E-07 -3.25E-07 -3.22E-07 -3.30E-07 -3.33E-07 -3.62E-07 -3.63E-07 -3.41E-07 -3.53E-07 -3.11E-07 60 -3.33E-07 -3.26E-07 -3.23E-07 -3.20E-07 -3.28E-07 -3.31E-07 -3.60E-07 -3.60E-07 -3.39E-07 -3.48E-07 -3.11E-07 70 -3.33E-07 -3.23E-07 -3.20E-07 -3.17E-07 -3.26E-07 -3.20E-07 -3.49E-07 -3.50E-07 -3.28E-07 -3.32E-07 -3.12E-07 -3.19E-07 6.69E-09 -3.01E-07 -3.37E-07 -3.26E-07 5.44E-09 -3.11E-07 -3.41E-07 -3.26E-07 6.62E-09 -3.08E-07 -3.44E-07 -3.26E-07 5.44E-09 -3.11E-07 -3.41E-07 -3.28E-07 5.09E-09 -3.14E-07 -3.42E-07 -3.26E-07 5.06E-09 -3.12E-07 -3.40E-07 -3.24E-07 6.09E-09 -3.07E-07 -3.41E-07 -3.17E-07 1.13E-08 -2.86E-07 -3.48E-07 -6.50E-07 PASS 6.50E-07 PASS -3.41E-07 1.28E-08 -3.06E-07 -3.77E-07 -7.00E-07 PASS 7.00E-07 PASS -3.38E-07 1.34E-08 -3.01E-07 -3.74E-07 -7.50E-07 PASS 7.50E-07 PASS -3.41E-07 1.28E-08 -3.06E-07 -3.77E-07 -7.50E-07 PASS 7.50E-07 PASS -3.50E-07 1.31E-08 -3.15E-07 -3.86E-07 -8.00E-07 PASS 8.00E-07 PASS -3.48E-07 1.29E-08 -3.12E-07 -3.83E-07 -8.00E-07 PASS 8.00E-07 PASS -3.36E-07 1.31E-08 -3.00E-07 -3.72E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 236 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=0V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.115. Plot of Positive Input Bias Current @ 3V, VCM=0V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 237 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.115. Raw data for Positive Input Bias Current @ 3V, VCM=0V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=0V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.13E-07 -3.17E-07 -3.16E-07 -3.21E-07 -3.20E-07 -3.05E-07 -3.33E-07 -3.29E-07 -3.10E-07 -3.14E-07 -3.09E-07 10 -3.19E-07 -3.27E-07 -3.25E-07 -3.28E-07 -3.28E-07 -3.28E-07 -3.57E-07 -3.58E-07 -3.34E-07 -3.38E-07 -3.10E-07 20 -3.20E-07 -3.26E-07 -3.23E-07 -3.27E-07 -3.27E-07 -3.23E-07 -3.53E-07 -3.55E-07 -3.30E-07 -3.34E-07 -3.11E-07 30 -3.19E-07 -3.27E-07 -3.25E-07 -3.28E-07 -3.28E-07 -3.28E-07 -3.57E-07 -3.58E-07 -3.34E-07 -3.38E-07 -3.10E-07 50 -3.20E-07 -3.30E-07 -3.27E-07 -3.29E-07 -3.29E-07 -3.34E-07 -3.63E-07 -3.66E-07 -3.41E-07 -3.51E-07 -3.10E-07 60 -3.18E-07 -3.29E-07 -3.25E-07 -3.27E-07 -3.27E-07 -3.33E-07 -3.61E-07 -3.63E-07 -3.39E-07 -3.49E-07 -3.09E-07 70 -3.17E-07 -3.25E-07 -3.22E-07 -3.25E-07 -3.24E-07 -3.22E-07 -3.51E-07 -3.54E-07 -3.27E-07 -3.32E-07 -3.10E-07 -3.17E-07 2.85E-09 -3.10E-07 -3.25E-07 -3.25E-07 3.78E-09 -3.15E-07 -3.36E-07 -3.25E-07 2.86E-09 -3.17E-07 -3.32E-07 -3.25E-07 3.78E-09 -3.15E-07 -3.36E-07 -3.27E-07 4.11E-09 -3.16E-07 -3.38E-07 -3.25E-07 4.06E-09 -3.14E-07 -3.36E-07 -3.23E-07 3.07E-09 -3.14E-07 -3.31E-07 -3.18E-07 1.22E-08 -2.85E-07 -3.51E-07 -6.50E-07 PASS 6.50E-07 PASS -3.43E-07 1.37E-08 -3.05E-07 -3.80E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.42E-08 -3.00E-07 -3.78E-07 -7.50E-07 PASS 7.50E-07 PASS -3.43E-07 1.37E-08 -3.05E-07 -3.80E-07 -7.50E-07 PASS 7.50E-07 PASS -3.51E-07 1.37E-08 -3.14E-07 -3.89E-07 -8.00E-07 PASS 8.00E-07 PASS -3.49E-07 1.32E-08 -3.13E-07 -3.85E-07 -8.00E-07 PASS 8.00E-07 PASS -3.37E-07 1.43E-08 -2.98E-07 -3.76E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 238 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=0V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.116. Plot of Positive Input Bias Current @ 3V, VCM=0V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 239 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.116. Raw data for Positive Input Bias Current @ 3V, VCM=0V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=0V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.46E-07 -3.02E-07 -3.05E-07 -3.19E-07 -3.30E-07 -3.29E-07 -3.32E-07 -3.23E-07 -3.06E-07 -3.11E-07 -3.27E-07 10 -3.52E-07 -3.13E-07 -3.14E-07 -3.25E-07 -3.38E-07 -3.54E-07 -3.60E-07 -3.52E-07 -3.29E-07 -3.34E-07 -3.28E-07 20 -3.54E-07 -3.12E-07 -3.12E-07 -3.24E-07 -3.37E-07 -3.52E-07 -3.56E-07 -3.48E-07 -3.25E-07 -3.30E-07 -3.29E-07 30 -3.52E-07 -3.13E-07 -3.14E-07 -3.25E-07 -3.38E-07 -3.54E-07 -3.60E-07 -3.52E-07 -3.29E-07 -3.34E-07 -3.28E-07 50 -3.52E-07 -3.16E-07 -3.16E-07 -3.26E-07 -3.40E-07 -3.62E-07 -3.67E-07 -3.59E-07 -3.36E-07 -3.46E-07 -3.28E-07 60 -3.51E-07 -3.14E-07 -3.15E-07 -3.24E-07 -3.38E-07 -3.59E-07 -3.65E-07 -3.57E-07 -3.34E-07 -3.39E-07 -3.27E-07 70 -3.52E-07 -3.11E-07 -3.11E-07 -3.23E-07 -3.35E-07 -3.50E-07 -3.55E-07 -3.47E-07 -3.22E-07 -3.28E-07 -3.28E-07 -3.21E-07 1.80E-08 -2.71E-07 -3.70E-07 -3.28E-07 1.67E-08 -2.83E-07 -3.74E-07 -3.28E-07 1.78E-08 -2.79E-07 -3.77E-07 -3.28E-07 1.67E-08 -2.83E-07 -3.74E-07 -3.30E-07 1.56E-08 -2.87E-07 -3.73E-07 -3.28E-07 1.58E-08 -2.85E-07 -3.72E-07 -3.26E-07 1.73E-08 -2.79E-07 -3.74E-07 -3.20E-07 1.14E-08 -2.89E-07 -3.51E-07 -6.50E-07 PASS 6.50E-07 PASS -3.46E-07 1.37E-08 -3.08E-07 -3.84E-07 -7.00E-07 PASS 7.00E-07 PASS -3.42E-07 1.38E-08 -3.04E-07 -3.80E-07 -7.50E-07 PASS 7.50E-07 PASS -3.46E-07 1.37E-08 -3.08E-07 -3.84E-07 -7.50E-07 PASS 7.50E-07 PASS -3.54E-07 1.27E-08 -3.19E-07 -3.89E-07 -8.00E-07 PASS 8.00E-07 PASS -3.51E-07 1.35E-08 -3.14E-07 -3.88E-07 -8.00E-07 PASS 8.00E-07 PASS -3.40E-07 1.45E-08 -3.01E-07 -3.80E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 240 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=0V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.117. Plot of Negative Input Bias Current @ 3V, VCM=0V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 241 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.117. Raw data for Negative Input Bias Current @ 3V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=0V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.35E-07 -3.13E-07 -3.03E-07 -3.26E-07 -3.31E-07 -3.29E-07 -3.28E-07 -3.12E-07 -3.06E-07 -3.09E-07 -3.29E-07 10 -3.41E-07 -3.24E-07 -3.12E-07 -3.32E-07 -3.40E-07 -3.58E-07 -3.59E-07 -3.38E-07 -3.30E-07 -3.32E-07 -3.30E-07 20 -3.46E-07 -3.23E-07 -3.10E-07 -3.31E-07 -3.39E-07 -3.54E-07 -3.56E-07 -3.33E-07 -3.26E-07 -3.28E-07 -3.30E-07 30 -3.41E-07 -3.24E-07 -3.12E-07 -3.32E-07 -3.40E-07 -3.58E-07 -3.59E-07 -3.38E-07 -3.30E-07 -3.32E-07 -3.30E-07 50 -3.44E-07 -3.27E-07 -3.14E-07 -3.34E-07 -3.46E-07 -3.63E-07 -3.68E-07 -3.50E-07 -3.37E-07 -3.40E-07 -3.29E-07 60 -3.41E-07 -3.25E-07 -3.12E-07 -3.32E-07 -3.40E-07 -3.62E-07 -3.66E-07 -3.48E-07 -3.35E-07 -3.37E-07 -3.28E-07 70 -3.39E-07 -3.21E-07 -3.09E-07 -3.30E-07 -3.37E-07 -3.51E-07 -3.52E-07 -3.32E-07 -3.23E-07 -3.26E-07 -3.29E-07 -3.22E-07 1.34E-08 -2.85E-07 -3.58E-07 -3.30E-07 1.22E-08 -2.96E-07 -3.63E-07 -3.30E-07 1.41E-08 -2.91E-07 -3.69E-07 -3.30E-07 1.22E-08 -2.96E-07 -3.63E-07 -3.33E-07 1.31E-08 -2.97E-07 -3.69E-07 -3.30E-07 1.17E-08 -2.98E-07 -3.62E-07 -3.27E-07 1.24E-08 -2.93E-07 -3.61E-07 -3.17E-07 1.12E-08 -2.86E-07 -3.48E-07 -6.50E-07 PASS 6.50E-07 PASS -3.43E-07 1.42E-08 -3.04E-07 -3.82E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.45E-08 -3.00E-07 -3.79E-07 -7.50E-07 PASS 7.50E-07 PASS -3.43E-07 1.42E-08 -3.04E-07 -3.82E-07 -7.50E-07 PASS 7.50E-07 PASS -3.51E-07 1.37E-08 -3.14E-07 -3.89E-07 -8.00E-07 PASS 8.00E-07 PASS -3.50E-07 1.40E-08 -3.11E-07 -3.88E-07 -8.00E-07 PASS 8.00E-07 PASS -3.37E-07 1.40E-08 -2.98E-07 -3.75E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 242 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=0V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.118. Plot of Negative Input Bias Current @ 3V, VCM=0V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 243 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.118. Raw data for Negative Input Bias Current @ 3V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=0V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.19E-07 -3.17E-07 -3.15E-07 -3.20E-07 -3.23E-07 -3.04E-07 -3.32E-07 -3.31E-07 -3.10E-07 -3.15E-07 -3.06E-07 10 -3.24E-07 -3.26E-07 -3.23E-07 -3.26E-07 -3.31E-07 -3.27E-07 -3.57E-07 -3.61E-07 -3.33E-07 -3.40E-07 -3.07E-07 20 -3.26E-07 -3.25E-07 -3.22E-07 -3.25E-07 -3.29E-07 -3.23E-07 -3.53E-07 -3.57E-07 -3.29E-07 -3.35E-07 -3.07E-07 30 -3.24E-07 -3.26E-07 -3.23E-07 -3.26E-07 -3.31E-07 -3.27E-07 -3.57E-07 -3.61E-07 -3.33E-07 -3.40E-07 -3.07E-07 50 -3.25E-07 -3.29E-07 -3.25E-07 -3.28E-07 -3.32E-07 -3.35E-07 -3.63E-07 -3.68E-07 -3.41E-07 -3.55E-07 -3.06E-07 60 -3.23E-07 -3.27E-07 -3.23E-07 -3.26E-07 -3.30E-07 -3.32E-07 -3.60E-07 -3.65E-07 -3.39E-07 -3.54E-07 -3.06E-07 70 -3.22E-07 -3.24E-07 -3.20E-07 -3.23E-07 -3.27E-07 -3.22E-07 -3.52E-07 -3.54E-07 -3.27E-07 -3.34E-07 -3.06E-07 -3.19E-07 2.90E-09 -3.11E-07 -3.27E-07 -3.26E-07 2.93E-09 -3.18E-07 -3.34E-07 -3.25E-07 2.68E-09 -3.18E-07 -3.33E-07 -3.26E-07 2.93E-09 -3.18E-07 -3.34E-07 -3.28E-07 2.93E-09 -3.20E-07 -3.36E-07 -3.26E-07 3.03E-09 -3.18E-07 -3.34E-07 -3.23E-07 2.49E-09 -3.17E-07 -3.30E-07 -3.18E-07 1.27E-08 -2.84E-07 -3.53E-07 -6.50E-07 PASS 6.50E-07 PASS -3.44E-07 1.48E-08 -3.03E-07 -3.84E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.47E-08 -2.99E-07 -3.80E-07 -7.50E-07 PASS 7.50E-07 PASS -3.44E-07 1.48E-08 -3.03E-07 -3.84E-07 -7.50E-07 PASS 7.50E-07 PASS -3.52E-07 1.43E-08 -3.13E-07 -3.91E-07 -8.00E-07 PASS 8.00E-07 PASS -3.50E-07 1.40E-08 -3.12E-07 -3.88E-07 -8.00E-07 PASS 8.00E-07 PASS -3.37E-07 1.45E-08 -2.98E-07 -3.77E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 244 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=0V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.119. Plot of Negative Input Bias Current @ 3V, VCM=0V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 245 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.119. Raw data for Negative Input Bias Current @ 3V, VCM=0V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=0V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.13E-07 -3.17E-07 -3.21E-07 -3.20E-07 -3.17E-07 -3.01E-07 -3.30E-07 -3.32E-07 -3.11E-07 -3.17E-07 -3.12E-07 10 -3.18E-07 -3.27E-07 -3.30E-07 -3.26E-07 -3.26E-07 -3.24E-07 -3.54E-07 -3.63E-07 -3.35E-07 -3.47E-07 -3.13E-07 20 -3.20E-07 -3.25E-07 -3.28E-07 -3.25E-07 -3.25E-07 -3.19E-07 -3.52E-07 -3.58E-07 -3.31E-07 -3.37E-07 -3.13E-07 30 -3.18E-07 -3.27E-07 -3.30E-07 -3.26E-07 -3.26E-07 -3.24E-07 -3.54E-07 -3.63E-07 -3.35E-07 -3.47E-07 -3.13E-07 50 -3.20E-07 -3.29E-07 -3.32E-07 -3.27E-07 -3.27E-07 -3.32E-07 -3.60E-07 -3.71E-07 -3.46E-07 -3.55E-07 -3.12E-07 60 -3.18E-07 -3.28E-07 -3.30E-07 -3.25E-07 -3.25E-07 -3.30E-07 -3.59E-07 -3.68E-07 -3.41E-07 -3.53E-07 -3.11E-07 70 -3.17E-07 -3.24E-07 -3.27E-07 -3.23E-07 -3.22E-07 -3.19E-07 -3.49E-07 -3.56E-07 -3.28E-07 -3.35E-07 -3.13E-07 -3.18E-07 3.05E-09 -3.09E-07 -3.26E-07 -3.25E-07 4.24E-09 -3.14E-07 -3.37E-07 -3.25E-07 3.20E-09 -3.16E-07 -3.33E-07 -3.25E-07 4.24E-09 -3.14E-07 -3.37E-07 -3.27E-07 4.60E-09 -3.14E-07 -3.39E-07 -3.25E-07 4.49E-09 -3.13E-07 -3.37E-07 -3.23E-07 3.63E-09 -3.13E-07 -3.33E-07 -3.18E-07 1.30E-08 -2.83E-07 -3.54E-07 -6.50E-07 PASS 6.50E-07 PASS -3.45E-07 1.53E-08 -3.03E-07 -3.87E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.56E-08 -2.97E-07 -3.82E-07 -7.50E-07 PASS 7.50E-07 PASS -3.45E-07 1.53E-08 -3.03E-07 -3.87E-07 -7.50E-07 PASS 7.50E-07 PASS -3.53E-07 1.48E-08 -3.12E-07 -3.93E-07 -8.00E-07 PASS 8.00E-07 PASS -3.50E-07 1.50E-08 -3.09E-07 -3.91E-07 -8.00E-07 PASS 8.00E-07 PASS -3.38E-07 1.52E-08 -2.96E-07 -3.79E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 246 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=0V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.120. Plot of Negative Input Bias Current @ 3V, VCM=0V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 247 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.120. Raw data for Negative Input Bias Current @ 3V, VCM=0V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=0V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.47E-07 -3.07E-07 -3.01E-07 -3.17E-07 -3.29E-07 -3.28E-07 -3.34E-07 -3.12E-07 -3.02E-07 -3.06E-07 -3.27E-07 10 -3.51E-07 -3.18E-07 -3.10E-07 -3.24E-07 -3.37E-07 -3.55E-07 -3.65E-07 -3.36E-07 -3.26E-07 -3.30E-07 -3.28E-07 20 -3.52E-07 -3.16E-07 -3.08E-07 -3.23E-07 -3.36E-07 -3.52E-07 -3.60E-07 -3.32E-07 -3.22E-07 -3.26E-07 -3.29E-07 30 -3.51E-07 -3.18E-07 -3.10E-07 -3.24E-07 -3.37E-07 -3.55E-07 -3.65E-07 -3.36E-07 -3.26E-07 -3.30E-07 -3.28E-07 50 -3.52E-07 -3.21E-07 -3.13E-07 -3.26E-07 -3.38E-07 -3.62E-07 -3.72E-07 -3.49E-07 -3.33E-07 -3.38E-07 -3.28E-07 60 -3.51E-07 -3.19E-07 -3.11E-07 -3.24E-07 -3.36E-07 -3.59E-07 -3.70E-07 -3.46E-07 -3.31E-07 -3.36E-07 -3.27E-07 70 -3.50E-07 -3.15E-07 -3.08E-07 -3.22E-07 -3.34E-07 -3.48E-07 -3.58E-07 -3.30E-07 -3.19E-07 -3.24E-07 -3.28E-07 -3.20E-07 1.84E-08 -2.70E-07 -3.71E-07 -3.28E-07 1.64E-08 -2.83E-07 -3.73E-07 -3.27E-07 1.74E-08 -2.79E-07 -3.75E-07 -3.28E-07 1.64E-08 -2.83E-07 -3.73E-07 -3.30E-07 1.54E-08 -2.88E-07 -3.72E-07 -3.28E-07 1.58E-08 -2.85E-07 -3.71E-07 -3.26E-07 1.67E-08 -2.80E-07 -3.72E-07 -3.16E-07 1.40E-08 -2.78E-07 -3.55E-07 -6.50E-07 PASS 6.50E-07 PASS -3.42E-07 1.69E-08 -2.96E-07 -3.89E-07 -7.00E-07 PASS 7.00E-07 PASS -3.38E-07 1.68E-08 -2.92E-07 -3.84E-07 -7.50E-07 PASS 7.50E-07 PASS -3.42E-07 1.69E-08 -2.96E-07 -3.89E-07 -7.50E-07 PASS 7.50E-07 PASS -3.51E-07 1.62E-08 -3.06E-07 -3.95E-07 -8.00E-07 PASS 8.00E-07 PASS -3.48E-07 1.60E-08 -3.05E-07 -3.92E-07 -8.00E-07 PASS 8.00E-07 PASS -3.36E-07 1.67E-08 -2.90E-07 -3.82E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 248 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 3V, VCM=3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.121. Plot of Input Offset Voltage @ 3V, VCM=3V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 249 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.121. Raw data for Input Offset Voltage @ 3V, VCM=3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.54E-05 1.77E-04 1.41E-04 2.08E-04 -7.87E-05 1.03E-04 -1.20E-04 -3.34E-05 2.64E-04 -1.73E-04 -2.42E-04 10 2.49E-05 1.42E-04 1.26E-04 2.05E-04 -8.12E-05 9.73E-05 -1.31E-04 -4.30E-05 2.59E-04 -1.69E-04 -2.42E-04 20 2.01E-05 1.46E-04 1.26E-04 2.05E-04 -8.43E-05 9.90E-05 -1.31E-04 -4.34E-05 2.59E-04 -1.73E-04 -2.42E-04 30 2.49E-05 1.42E-04 1.26E-04 2.05E-04 -8.12E-05 9.73E-05 -1.31E-04 -4.30E-05 2.59E-04 -1.69E-04 -2.42E-04 50 3.53E-05 1.42E-04 1.24E-04 2.20E-04 -7.79E-05 1.02E-04 -1.29E-04 -4.07E-05 2.61E-04 -1.67E-04 -2.44E-04 60 3.54E-05 1.43E-04 1.25E-04 2.23E-04 -7.66E-05 1.02E-04 -1.27E-04 -4.00E-05 2.62E-04 -1.67E-04 -2.44E-04 70 8.49E-06 1.25E-04 1.15E-04 1.95E-04 -5.61E-05 7.69E-05 -1.32E-04 -3.66E-05 2.56E-04 -1.49E-04 -2.43E-04 9.26E-05 1.21E-04 4.23E-04 -2.38E-04 8.34E-05 1.13E-04 3.92E-04 -2.25E-04 8.25E-05 1.15E-04 3.97E-04 -2.32E-04 8.34E-05 1.13E-04 3.92E-04 -2.25E-04 8.87E-05 1.14E-04 4.01E-04 -2.24E-04 8.99E-05 1.14E-04 4.04E-04 -2.24E-04 7.74E-05 1.00E-04 3.52E-04 -1.97E-04 7.99E-06 1.77E-04 4.93E-04 -4.77E-04 -8.00E-04 PASS 8.00E-04 PASS 2.67E-06 1.76E-04 4.86E-04 -4.81E-04 -9.50E-04 PASS 9.50E-04 PASS 2.33E-06 1.77E-04 4.89E-04 -4.84E-04 -9.50E-04 PASS 9.50E-04 PASS 2.67E-06 1.76E-04 4.86E-04 -4.81E-04 -9.50E-04 PASS 9.50E-04 PASS 5.20E-06 1.76E-04 4.89E-04 -4.79E-04 -9.50E-04 PASS 9.50E-04 PASS 5.85E-06 1.77E-04 4.90E-04 -4.78E-04 -9.50E-04 PASS 9.50E-04 PASS 3.03E-06 1.68E-04 4.63E-04 -4.57E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 250 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 3V, VCM=3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.122. Plot of Input Offset Voltage @ 3V, VCM=3V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 251 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.122. Raw data for Input Offset Voltage @ 3V, VCM=3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.98E-04 2.21E-04 2.76E-04 4.20E-04 4.39E-04 3.91E-04 1.79E-04 -1.06E-04 3.79E-06 1.06E-04 -9.86E-05 10 1.98E-04 2.11E-04 2.66E-04 4.14E-04 4.07E-04 3.86E-04 1.86E-04 -1.07E-04 7.28E-06 9.39E-05 -9.77E-05 20 1.97E-04 2.09E-04 2.64E-04 4.12E-04 4.07E-04 3.86E-04 1.84E-04 -1.09E-04 5.23E-06 9.36E-05 -1.01E-04 30 1.98E-04 2.11E-04 2.66E-04 4.14E-04 4.07E-04 3.86E-04 1.86E-04 -1.07E-04 7.28E-06 9.39E-05 -9.77E-05 50 2.15E-04 2.31E-04 2.78E-04 4.29E-04 4.17E-04 3.87E-04 1.89E-04 -1.07E-04 2.09E-06 9.59E-05 -1.01E-04 60 2.20E-04 2.32E-04 2.79E-04 4.33E-04 4.24E-04 3.88E-04 1.89E-04 -1.09E-04 5.83E-06 9.72E-05 -1.02E-04 70 1.91E-04 2.17E-04 2.52E-04 4.02E-04 4.10E-04 3.79E-04 1.78E-04 -1.11E-04 -4.92E-06 8.48E-05 -1.00E-04 3.11E-04 1.12E-04 6.19E-04 2.76E-06 2.99E-04 1.05E-04 5.87E-04 1.15E-05 2.98E-04 1.05E-04 5.86E-04 9.37E-06 2.99E-04 1.05E-04 5.87E-04 1.15E-05 3.14E-04 1.02E-04 5.94E-04 3.38E-05 3.18E-04 1.04E-04 6.02E-04 3.36E-05 2.94E-04 1.04E-04 5.80E-04 9.35E-06 1.15E-04 1.88E-04 6.31E-04 -4.01E-04 -8.00E-04 PASS 8.00E-04 PASS 1.13E-04 1.87E-04 6.26E-04 -3.99E-04 -9.50E-04 PASS 9.50E-04 PASS 1.12E-04 1.88E-04 6.27E-04 -4.03E-04 -9.50E-04 PASS 9.50E-04 PASS 1.13E-04 1.87E-04 6.26E-04 -3.99E-04 -9.50E-04 PASS 9.50E-04 PASS 1.13E-04 1.88E-04 6.29E-04 -4.03E-04 -9.50E-04 PASS 9.50E-04 PASS 1.14E-04 1.89E-04 6.32E-04 -4.03E-04 -9.50E-04 PASS 9.50E-04 PASS 1.05E-04 1.87E-04 6.18E-04 -4.08E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 252 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 3V, VCM=3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.123. Plot of Input Offset Voltage @ 3V, VCM=3V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 253 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.123. Raw data for Input Offset Voltage @ 3V, VCM=3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 9.04E-05 1.39E-04 1.72E-04 3.02E-04 3.97E-05 1.25E-04 5.22E-05 2.49E-04 -1.49E-04 2.24E-04 1.42E-04 10 7.60E-05 8.91E-05 1.65E-04 2.66E-04 3.18E-05 1.15E-04 4.71E-05 2.41E-04 -1.53E-04 2.17E-04 1.41E-04 20 7.42E-05 9.16E-05 1.63E-04 2.63E-04 2.19E-05 1.13E-04 4.56E-05 2.40E-04 -1.55E-04 2.15E-04 1.40E-04 30 7.60E-05 8.91E-05 1.65E-04 2.66E-04 3.18E-05 1.15E-04 4.71E-05 2.41E-04 -1.53E-04 2.17E-04 1.41E-04 50 7.26E-05 7.82E-05 1.77E-04 2.75E-04 3.24E-05 1.16E-04 4.78E-05 2.41E-04 -1.51E-04 2.21E-04 1.38E-04 60 7.35E-05 8.30E-05 1.82E-04 2.79E-04 3.31E-05 1.18E-04 4.79E-05 2.44E-04 -1.49E-04 2.20E-04 1.40E-04 70 5.40E-05 8.58E-05 1.57E-04 2.75E-04 3.45E-05 1.16E-04 3.26E-05 2.39E-04 -1.56E-04 2.13E-04 1.39E-04 1.49E-04 9.92E-05 4.21E-04 -1.24E-04 1.26E-04 9.22E-05 3.79E-04 -1.27E-04 1.23E-04 9.33E-05 3.79E-04 -1.33E-04 1.26E-04 9.22E-05 3.79E-04 -1.27E-04 1.27E-04 9.85E-05 3.97E-04 -1.43E-04 1.30E-04 9.96E-05 4.03E-04 -1.43E-04 1.21E-04 9.77E-05 3.89E-04 -1.47E-04 1.00E-04 1.60E-04 5.39E-04 -3.38E-04 -8.00E-04 PASS 8.00E-04 PASS 9.35E-05 1.59E-04 5.28E-04 -3.41E-04 -9.50E-04 PASS 9.50E-04 PASS 9.18E-05 1.58E-04 5.26E-04 -3.43E-04 -9.50E-04 PASS 9.50E-04 PASS 9.35E-05 1.59E-04 5.28E-04 -3.41E-04 -9.50E-04 PASS 9.50E-04 PASS 9.49E-05 1.58E-04 5.29E-04 -3.39E-04 -9.50E-04 PASS 9.50E-04 PASS 9.62E-05 1.58E-04 5.30E-04 -3.37E-04 -9.50E-04 PASS 9.50E-04 PASS 8.89E-05 1.60E-04 5.27E-04 -3.49E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 254 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 3V, VCM=3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.124. Plot of Input Offset Voltage @ 3V, VCM=3V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 255 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.124. Raw data for Input Offset Voltage @ 3V, VCM=3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 3V, VCM=3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -4.65E-05 3.11E-04 -1.43E-04 1.22E-04 -1.69E-04 1.73E-04 9.04E-05 6.25E-05 4.25E-04 7.92E-05 4.39E-05 10 -3.17E-05 2.96E-04 -1.55E-04 1.18E-04 -1.65E-04 1.66E-04 8.83E-05 6.38E-05 4.18E-04 8.31E-05 4.29E-05 20 -3.98E-05 2.96E-04 -1.59E-04 1.13E-04 -1.73E-04 1.68E-04 8.76E-05 6.36E-05 4.16E-04 8.34E-05 4.24E-05 30 -3.17E-05 2.96E-04 -1.55E-04 1.18E-04 -1.65E-04 1.66E-04 8.83E-05 6.38E-05 4.18E-04 8.31E-05 4.29E-05 50 -1.20E-05 3.04E-04 -1.59E-04 1.27E-04 -1.53E-04 1.66E-04 8.69E-05 7.01E-05 4.20E-04 8.30E-05 4.16E-05 60 -1.23E-05 3.09E-04 -1.59E-04 1.27E-04 -1.53E-04 1.68E-04 8.93E-05 6.95E-05 4.24E-04 8.33E-05 4.24E-05 70 -3.38E-05 2.88E-04 -1.58E-04 1.29E-04 -1.59E-04 1.67E-04 8.57E-05 6.48E-05 4.13E-04 7.84E-05 4.17E-05 1.50E-05 2.01E-04 5.66E-04 -5.36E-04 1.25E-05 1.96E-04 5.49E-04 -5.24E-04 7.43E-06 1.98E-04 5.50E-04 -5.35E-04 1.25E-05 1.96E-04 5.49E-04 -5.24E-04 2.13E-05 1.97E-04 5.62E-04 -5.19E-04 2.24E-05 1.99E-04 5.67E-04 -5.22E-04 1.34E-05 1.94E-04 5.45E-04 -5.18E-04 1.66E-04 1.51E-04 5.80E-04 -2.48E-04 -8.00E-04 PASS 8.00E-04 PASS 1.64E-04 1.47E-04 5.68E-04 -2.40E-04 -9.50E-04 PASS 9.50E-04 PASS 1.64E-04 1.46E-04 5.65E-04 -2.38E-04 -9.50E-04 PASS 9.50E-04 PASS 1.64E-04 1.47E-04 5.68E-04 -2.40E-04 -9.50E-04 PASS 9.50E-04 PASS 1.65E-04 1.47E-04 5.69E-04 -2.39E-04 -9.50E-04 PASS 9.50E-04 PASS 1.67E-04 1.49E-04 5.75E-04 -2.41E-04 -9.50E-04 PASS 9.50E-04 PASS 1.62E-04 1.46E-04 5.62E-04 -2.39E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 256 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 3V, VCM=3V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.125. Plot of Input Offset Current @ 3V, VCM=3V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 257 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.125. Raw data for Input Offset Current @ 3V, VCM=3V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=3V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 5.54E-09 1.02E-08 8.17E-09 -5.27E-09 6.91E-09 -1.07E-08 -2.63E-08 -2.66E-09 -3.53E-09 8.01E-09 -6.17E-09 10 5.11E-09 8.01E-09 7.09E-09 -5.83E-09 9.97E-09 -9.88E-09 -2.84E-08 -2.32E-09 -3.13E-09 1.04E-08 -6.19E-09 20 5.09E-09 8.82E-09 7.00E-09 -5.00E-09 1.30E-08 -1.05E-08 -2.81E-08 -2.11E-09 -2.15E-09 9.70E-09 -6.12E-09 30 5.11E-09 8.01E-09 7.09E-09 -5.83E-09 9.97E-09 -9.88E-09 -2.84E-08 -2.32E-09 -3.13E-09 1.04E-08 -6.19E-09 50 5.86E-09 7.91E-09 7.14E-09 -5.83E-09 9.40E-09 -9.33E-09 -2.82E-08 -2.99E-09 -4.14E-09 9.53E-09 -6.01E-09 60 5.84E-09 7.53E-09 6.92E-09 -5.47E-09 9.41E-09 -8.97E-09 -2.74E-08 -2.42E-09 -3.35E-09 1.01E-08 -6.03E-09 70 4.28E-09 9.23E-09 7.73E-09 -5.73E-09 8.64E-09 -1.10E-08 -2.82E-08 -2.11E-09 -4.27E-09 8.81E-09 -6.06E-09 5.10E-09 6.05E-09 2.17E-08 -1.15E-08 4.87E-09 6.23E-09 2.20E-08 -1.22E-08 5.77E-09 6.69E-09 2.41E-08 -1.26E-08 4.87E-09 6.23E-09 2.20E-08 -1.22E-08 4.90E-09 6.13E-09 2.17E-08 -1.19E-08 4.85E-09 5.91E-09 2.11E-08 -1.14E-08 4.83E-09 6.21E-09 2.18E-08 -1.22E-08 -7.04E-09 1.27E-08 2.78E-08 -4.18E-08 -6.50E-08 PASS 6.50E-08 PASS -6.66E-09 1.42E-08 3.22E-08 -4.55E-08 -6.50E-08 PASS 6.50E-08 PASS -6.63E-09 1.40E-08 3.18E-08 -4.50E-08 -6.50E-08 PASS 6.50E-08 PASS -6.66E-09 1.42E-08 3.22E-08 -4.55E-08 -6.50E-08 PASS 6.50E-08 PASS -7.03E-09 1.37E-08 3.06E-08 -4.46E-08 -6.50E-08 PASS 6.50E-08 PASS -6.41E-09 1.37E-08 3.11E-08 -4.39E-08 -6.50E-08 PASS 6.50E-08 PASS -7.35E-09 1.37E-08 3.01E-08 -4.48E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 258 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 3V, VCM=3V #2 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.126. Plot of Input Offset Current @ 3V, VCM=3V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 259 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.126. Raw data for Input Offset Current @ 3V, VCM=3V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=3V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.31E-08 -2.10E-08 -1.52E-09 7.24E-09 6.39E-09 5.50E-09 1.43E-08 -4.19E-09 1.46E-09 -5.48E-09 -2.84E-10 10 1.24E-08 -2.29E-08 7.60E-11 6.38E-09 4.15E-09 9.57E-09 1.50E-08 -2.12E-09 -2.41E-10 -4.52E-09 -3.29E-10 20 1.34E-08 -2.12E-08 -1.17E-09 7.13E-09 6.02E-09 9.52E-09 1.50E-08 -3.47E-09 -8.44E-10 -5.37E-09 -5.12E-10 30 1.24E-08 -2.29E-08 7.60E-11 6.38E-09 4.15E-09 9.57E-09 1.50E-08 -2.12E-09 -2.41E-10 -4.52E-09 -3.29E-10 50 1.33E-08 -1.36E-08 5.77E-10 6.45E-09 6.38E-09 9.48E-09 1.51E-08 -3.88E-09 -6.32E-10 -3.50E-09 -3.23E-10 60 1.64E-08 -1.37E-08 2.71E-10 5.90E-09 5.50E-09 8.78E-09 1.58E-08 -3.82E-09 1.42E-10 -3.24E-09 -3.54E-10 70 1.42E-08 -1.96E-08 -3.42E-10 5.99E-09 5.93E-09 7.92E-09 1.40E-08 -3.26E-09 1.35E-09 -5.69E-09 -3.86E-10 8.34E-10 1.33E-08 3.72E-08 -3.56E-08 1.14E-11 1.36E-08 3.72E-08 -3.72E-08 8.26E-10 1.33E-08 3.74E-08 -3.58E-08 1.14E-11 1.36E-08 3.72E-08 -3.72E-08 2.63E-09 1.01E-08 3.04E-08 -2.51E-08 2.88E-09 1.09E-08 3.29E-08 -2.71E-08 1.23E-09 1.27E-08 3.61E-08 -3.37E-08 2.33E-09 8.04E-09 2.44E-08 -1.97E-08 -6.50E-08 PASS 6.50E-08 PASS 3.54E-09 8.35E-09 2.64E-08 -1.94E-08 -6.50E-08 PASS 6.50E-08 PASS 2.97E-09 8.86E-09 2.73E-08 -2.13E-08 -6.50E-08 PASS 6.50E-08 PASS 3.54E-09 8.35E-09 2.64E-08 -1.94E-08 -6.50E-08 PASS 6.50E-08 PASS 3.31E-09 8.52E-09 2.67E-08 -2.01E-08 -6.50E-08 PASS 6.50E-08 PASS 3.54E-09 8.52E-09 2.69E-08 -1.98E-08 -6.50E-08 PASS 6.50E-08 PASS 2.87E-09 8.11E-09 2.51E-08 -1.94E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 260 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX Input Offset Current @ 3V, VCM=3V #3 (A) 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.127. Plot of Input Offset Current @ 3V, VCM=3V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 261 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.127. Raw data for Input Offset Current @ 3V, VCM=3V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=3V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.09E-08 -1.79E-08 -1.66E-08 1.33E-08 -3.39E-09 -4.65E-10 3.25E-09 -6.76E-10 -4.08E-10 7.40E-10 -2.23E-09 10 1.11E-08 -1.70E-08 -1.53E-08 1.10E-08 -4.01E-09 -3.71E-10 4.76E-09 2.21E-09 1.64E-09 3.35E-10 -2.42E-09 20 1.22E-08 -1.81E-08 -1.58E-08 1.06E-08 -5.13E-09 -2.06E-10 3.28E-09 2.22E-10 4.49E-10 6.41E-10 -2.25E-09 30 1.11E-08 -1.70E-08 -1.53E-08 1.10E-08 -4.01E-09 -3.71E-10 4.76E-09 2.21E-09 1.64E-09 3.35E-10 -2.42E-09 50 1.07E-08 -1.80E-08 -1.65E-08 1.13E-08 -4.15E-09 3.63E-10 3.54E-09 6.07E-10 1.02E-09 2.95E-10 -2.22E-09 60 1.15E-08 -1.75E-08 -1.59E-08 1.12E-08 -4.35E-09 7.67E-10 3.29E-09 1.45E-09 1.86E-09 -3.79E-10 -2.29E-09 70 1.05E-08 -1.73E-08 -1.53E-08 1.20E-08 -3.86E-09 -4.56E-10 2.09E-09 3.75E-10 -5.55E-10 -1.29E-09 -2.31E-09 -2.72E-09 1.47E-08 3.76E-08 -4.31E-08 -2.85E-09 1.36E-08 3.46E-08 -4.03E-08 -3.24E-09 1.43E-08 3.59E-08 -4.23E-08 -2.85E-09 1.36E-08 3.46E-08 -4.03E-08 -3.33E-09 1.42E-08 3.55E-08 -4.21E-08 -2.99E-09 1.41E-08 3.55E-08 -4.15E-08 -2.79E-09 1.38E-08 3.51E-08 -4.07E-08 4.88E-10 1.64E-09 4.99E-09 -4.01E-09 -6.50E-08 PASS 6.50E-08 PASS 1.71E-09 1.99E-09 7.16E-09 -3.73E-09 -6.50E-08 PASS 6.50E-08 PASS 8.76E-10 1.38E-09 4.65E-09 -2.90E-09 -6.50E-08 PASS 6.50E-08 PASS 1.71E-09 1.99E-09 7.16E-09 -3.73E-09 -6.50E-08 PASS 6.50E-08 PASS 1.17E-09 1.36E-09 4.88E-09 -2.55E-09 -6.50E-08 PASS 6.50E-08 PASS 1.40E-09 1.36E-09 5.11E-09 -2.32E-09 -6.50E-08 PASS 6.50E-08 PASS 3.28E-11 1.29E-09 3.58E-09 -3.51E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 262 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 3V, VCM=3V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.128. Plot of Input Offset Current @ 3V, VCM=3V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 263 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.128. Raw data for Input Offset Current @ 3V, VCM=3V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 3V, VCM=3V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.21E-08 -1.27E-09 -6.13E-09 -1.22E-08 6.87E-09 -8.33E-09 2.57E-09 1.37E-08 1.75E-09 -8.83E-09 -5.45E-09 10 1.12E-08 -7.82E-10 -5.29E-09 -1.20E-08 6.54E-09 -8.09E-09 2.22E-09 1.25E-08 6.33E-10 -7.79E-09 -5.39E-09 20 1.24E-08 -2.67E-10 -6.29E-09 -1.27E-08 6.43E-09 -7.63E-09 1.68E-09 1.32E-08 8.66E-10 -7.29E-09 -5.50E-09 30 1.12E-08 -7.82E-10 -5.29E-09 -1.20E-08 6.54E-09 -8.09E-09 2.22E-09 1.25E-08 6.33E-10 -7.79E-09 -5.39E-09 50 1.18E-08 -1.08E-09 -5.57E-09 -1.26E-08 6.84E-09 -8.74E-09 1.23E-09 1.21E-08 2.37E-09 -8.75E-09 -5.38E-09 60 1.14E-08 -7.94E-10 -5.01E-09 -1.16E-08 7.02E-09 -7.74E-09 1.86E-09 1.25E-08 2.79E-09 -8.12E-09 -5.24E-09 70 1.15E-08 -8.55E-10 -4.74E-09 -1.15E-08 6.67E-09 -8.40E-09 1.74E-09 1.37E-08 1.93E-09 -8.42E-09 -5.33E-09 -1.10E-10 9.77E-09 2.67E-08 -2.69E-08 -7.86E-11 9.23E-09 2.52E-08 -2.54E-08 -9.82E-11 9.96E-09 2.72E-08 -2.74E-08 -7.86E-11 9.23E-09 2.52E-08 -2.54E-08 -1.19E-10 9.70E-09 2.65E-08 -2.67E-08 1.96E-10 9.20E-09 2.54E-08 -2.50E-08 2.08E-10 9.10E-09 2.52E-08 -2.48E-08 1.72E-10 9.28E-09 2.56E-08 -2.53E-08 -6.50E-08 PASS 6.50E-08 PASS -9.42E-11 8.50E-09 2.32E-08 -2.34E-08 -6.50E-08 PASS 6.50E-08 PASS 1.62E-10 8.49E-09 2.35E-08 -2.31E-08 -6.50E-08 PASS 6.50E-08 PASS -9.42E-11 8.50E-09 2.32E-08 -2.34E-08 -6.50E-08 PASS 6.50E-08 PASS -3.68E-10 8.73E-09 2.36E-08 -2.43E-08 -6.50E-08 PASS 6.50E-08 PASS 2.48E-10 8.55E-09 2.37E-08 -2.32E-08 -6.50E-08 PASS 6.50E-08 PASS 1.08E-10 9.16E-09 2.52E-08 -2.50E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 264 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=3V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.129. Plot of Positive Input Bias Current @ 3V, VCM=3V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 265 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.129. Raw data for Positive Input Bias Current @ 3V, VCM=3V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=3V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.75E-07 3.85E-07 3.81E-07 4.07E-07 4.25E-07 4.44E-07 4.11E-07 3.86E-07 4.19E-07 3.93E-07 4.46E-07 10 5.45E-07 4.26E-07 4.19E-07 4.39E-07 4.62E-07 5.31E-07 5.00E-07 4.70E-07 5.12E-07 4.80E-07 4.45E-07 20 5.29E-07 4.17E-07 4.11E-07 4.32E-07 4.58E-07 5.11E-07 4.82E-07 4.53E-07 4.92E-07 4.62E-07 4.45E-07 30 5.45E-07 4.26E-07 4.19E-07 4.39E-07 4.62E-07 5.31E-07 5.00E-07 4.70E-07 5.12E-07 4.80E-07 4.45E-07 50 5.70E-07 4.43E-07 4.35E-07 4.52E-07 4.76E-07 5.62E-07 5.32E-07 5.00E-07 5.42E-07 5.09E-07 4.46E-07 60 5.67E-07 4.41E-07 4.34E-07 4.51E-07 4.74E-07 5.57E-07 5.27E-07 4.94E-07 5.37E-07 5.05E-07 4.46E-07 70 5.31E-07 4.22E-07 4.16E-07 4.34E-07 4.56E-07 5.12E-07 4.82E-07 4.58E-07 4.90E-07 4.65E-07 4.45E-07 4.15E-07 3.80E-08 5.19E-07 3.11E-07 4.58E-07 5.09E-08 5.98E-07 3.19E-07 4.49E-07 4.81E-08 5.81E-07 3.17E-07 4.58E-07 5.09E-08 5.98E-07 3.19E-07 4.75E-07 5.50E-08 6.26E-07 3.24E-07 4.73E-07 5.45E-08 6.23E-07 3.24E-07 4.52E-07 4.67E-08 5.80E-07 3.24E-07 4.11E-07 2.29E-08 4.73E-07 3.48E-07 -6.50E-07 PASS 6.50E-07 PASS 4.99E-07 2.46E-08 5.66E-07 4.31E-07 -7.00E-07 PASS 7.00E-07 PASS 4.80E-07 2.33E-08 5.44E-07 4.16E-07 -7.50E-07 PASS 7.50E-07 PASS 4.99E-07 2.46E-08 5.66E-07 4.31E-07 -7.50E-07 PASS 7.50E-07 PASS 5.29E-07 2.50E-08 5.98E-07 4.60E-07 -8.00E-07 PASS 8.00E-07 PASS 5.24E-07 2.53E-08 5.94E-07 4.55E-07 -8.00E-07 PASS 8.00E-07 PASS 4.82E-07 2.15E-08 5.41E-07 4.23E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 266 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=3V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.130. Plot of Positive Input Bias Current @ 3V, VCM=3V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 267 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.130. Raw data for Positive Input Bias Current @ 3V, VCM=3V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=3V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.51E-07 4.39E-07 4.17E-07 4.45E-07 4.65E-07 3.55E-07 4.32E-07 4.44E-07 4.18E-07 3.92E-07 3.92E-07 10 5.12E-07 4.83E-07 4.56E-07 4.83E-07 5.05E-07 4.37E-07 5.14E-07 5.37E-07 5.16E-07 4.82E-07 3.94E-07 20 5.03E-07 4.73E-07 4.46E-07 4.75E-07 4.98E-07 4.20E-07 4.98E-07 5.15E-07 4.98E-07 4.63E-07 3.92E-07 30 5.12E-07 4.83E-07 4.56E-07 4.83E-07 5.05E-07 4.37E-07 5.14E-07 5.37E-07 5.16E-07 4.82E-07 3.94E-07 50 5.40E-07 5.02E-07 4.71E-07 4.99E-07 5.23E-07 4.63E-07 5.43E-07 5.66E-07 5.47E-07 5.16E-07 3.92E-07 60 5.38E-07 4.99E-07 4.69E-07 4.95E-07 5.20E-07 4.61E-07 5.39E-07 5.63E-07 5.45E-07 5.11E-07 3.92E-07 70 5.06E-07 4.78E-07 4.51E-07 4.77E-07 5.03E-07 4.25E-07 4.95E-07 5.22E-07 4.98E-07 4.67E-07 3.91E-07 4.43E-07 1.77E-08 4.92E-07 3.95E-07 4.88E-07 2.21E-08 5.48E-07 4.27E-07 4.79E-07 2.31E-08 5.42E-07 4.16E-07 4.88E-07 2.21E-08 5.48E-07 4.27E-07 5.07E-07 2.63E-08 5.79E-07 4.35E-07 5.04E-07 2.62E-08 5.76E-07 4.32E-07 4.83E-07 2.22E-08 5.44E-07 4.22E-07 4.08E-07 3.56E-08 5.06E-07 3.10E-07 -6.50E-07 PASS 6.50E-07 PASS 4.97E-07 3.91E-08 6.04E-07 3.90E-07 -7.00E-07 PASS 7.00E-07 PASS 4.78E-07 3.80E-08 5.83E-07 3.74E-07 -7.50E-07 PASS 7.50E-07 PASS 4.97E-07 3.91E-08 6.04E-07 3.90E-07 -7.50E-07 PASS 7.50E-07 PASS 5.27E-07 4.02E-08 6.37E-07 4.17E-07 -8.00E-07 PASS 8.00E-07 PASS 5.24E-07 3.99E-08 6.33E-07 4.14E-07 -8.00E-07 PASS 8.00E-07 PASS 4.81E-07 3.72E-08 5.83E-07 3.79E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 268 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=3V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.131. Plot of Positive Input Bias Current @ 3V, VCM=3V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 269 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.131. Raw data for Positive Input Bias Current @ 3V, VCM=3V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=3V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.42E-07 4.40E-07 4.16E-07 4.51E-07 4.51E-07 3.57E-07 4.20E-07 4.53E-07 4.23E-07 3.93E-07 3.89E-07 10 5.06E-07 4.86E-07 4.51E-07 4.92E-07 4.91E-07 4.38E-07 5.01E-07 5.44E-07 5.16E-07 4.83E-07 3.87E-07 20 4.94E-07 4.76E-07 4.40E-07 4.82E-07 4.83E-07 4.19E-07 4.81E-07 5.25E-07 4.97E-07 4.64E-07 3.90E-07 30 5.06E-07 4.86E-07 4.51E-07 4.92E-07 4.91E-07 4.38E-07 5.01E-07 5.44E-07 5.16E-07 4.83E-07 3.87E-07 50 5.30E-07 5.03E-07 4.64E-07 5.10E-07 5.07E-07 4.65E-07 5.31E-07 5.76E-07 5.47E-07 5.14E-07 3.89E-07 60 5.27E-07 5.00E-07 4.62E-07 5.05E-07 5.06E-07 4.61E-07 5.26E-07 5.73E-07 5.44E-07 5.10E-07 3.87E-07 70 4.94E-07 4.80E-07 4.47E-07 4.84E-07 4.86E-07 4.25E-07 4.82E-07 5.28E-07 4.97E-07 4.67E-07 3.88E-07 4.40E-07 1.44E-08 4.79E-07 4.00E-07 4.85E-07 2.06E-08 5.42E-07 4.29E-07 4.75E-07 2.07E-08 5.32E-07 4.18E-07 4.85E-07 2.06E-08 5.42E-07 4.29E-07 5.03E-07 2.40E-08 5.69E-07 4.37E-07 5.00E-07 2.37E-08 5.65E-07 4.35E-07 4.78E-07 1.82E-08 5.28E-07 4.28E-07 4.09E-07 3.62E-08 5.08E-07 3.10E-07 -6.50E-07 PASS 6.50E-07 PASS 4.97E-07 3.95E-08 6.05E-07 3.88E-07 -7.00E-07 PASS 7.00E-07 PASS 4.77E-07 3.97E-08 5.86E-07 3.69E-07 -7.50E-07 PASS 7.50E-07 PASS 4.97E-07 3.95E-08 6.05E-07 3.88E-07 -7.50E-07 PASS 7.50E-07 PASS 5.27E-07 4.13E-08 6.40E-07 4.13E-07 -8.00E-07 PASS 8.00E-07 PASS 5.23E-07 4.15E-08 6.37E-07 4.09E-07 -8.00E-07 PASS 8.00E-07 PASS 4.80E-07 3.78E-08 5.83E-07 3.76E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 270 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 3V, VCM=3V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.132. Plot of Positive Input Bias Current @ 3V, VCM=3V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 271 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.132. Raw data for Positive Input Bias Current @ 3V, VCM=3V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 3V, VCM=3V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.82E-07 3.81E-07 3.73E-07 4.12E-07 4.30E-07 4.40E-07 4.13E-07 3.98E-07 4.13E-07 3.80E-07 4.45E-07 10 5.45E-07 4.23E-07 4.10E-07 4.44E-07 4.66E-07 5.25E-07 5.05E-07 4.83E-07 5.04E-07 4.59E-07 4.45E-07 20 5.33E-07 4.12E-07 4.01E-07 4.36E-07 4.57E-07 5.05E-07 4.85E-07 4.64E-07 4.85E-07 4.43E-07 4.45E-07 30 5.45E-07 4.23E-07 4.10E-07 4.44E-07 4.66E-07 5.25E-07 5.05E-07 4.83E-07 5.04E-07 4.59E-07 4.45E-07 50 5.72E-07 4.40E-07 4.25E-07 4.56E-07 4.78E-07 5.55E-07 5.38E-07 5.11E-07 5.35E-07 4.89E-07 4.45E-07 60 5.66E-07 4.37E-07 4.25E-07 4.54E-07 4.76E-07 5.51E-07 5.33E-07 5.07E-07 5.33E-07 4.85E-07 4.45E-07 70 5.36E-07 4.18E-07 4.04E-07 4.40E-07 4.60E-07 5.06E-07 4.86E-07 4.70E-07 4.89E-07 4.48E-07 4.45E-07 4.16E-07 4.34E-08 5.35E-07 2.97E-07 4.58E-07 5.32E-08 6.04E-07 3.12E-07 4.48E-07 5.23E-08 5.91E-07 3.05E-07 4.58E-07 5.32E-08 6.04E-07 3.12E-07 4.74E-07 5.79E-08 6.33E-07 3.16E-07 4.71E-07 5.61E-08 6.25E-07 3.18E-07 4.52E-07 5.18E-08 5.94E-07 3.10E-07 4.09E-07 2.21E-08 4.69E-07 3.48E-07 -6.50E-07 PASS 6.50E-07 PASS 4.95E-07 2.49E-08 5.63E-07 4.27E-07 -7.00E-07 PASS 7.00E-07 PASS 4.76E-07 2.37E-08 5.41E-07 4.12E-07 -7.50E-07 PASS 7.50E-07 PASS 4.95E-07 2.49E-08 5.63E-07 4.27E-07 -7.50E-07 PASS 7.50E-07 PASS 5.25E-07 2.58E-08 5.96E-07 4.54E-07 -8.00E-07 PASS 8.00E-07 PASS 5.22E-07 2.60E-08 5.93E-07 4.50E-07 -8.00E-07 PASS 8.00E-07 PASS 4.80E-07 2.18E-08 5.39E-07 4.20E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 272 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=3V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.133. Plot of Negative Input Bias Current @ 3V, VCM=3V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 273 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.133. Raw data for Negative Input Bias Current @ 3V, VCM=3V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=3V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.69E-07 3.76E-07 3.75E-07 4.12E-07 4.16E-07 4.54E-07 4.35E-07 3.87E-07 4.20E-07 3.87E-07 4.50E-07 10 5.38E-07 4.17E-07 4.12E-07 4.44E-07 4.52E-07 5.41E-07 5.28E-07 4.72E-07 5.14E-07 4.69E-07 4.49E-07 20 5.24E-07 4.06E-07 4.02E-07 4.36E-07 4.44E-07 5.21E-07 5.10E-07 4.54E-07 4.94E-07 4.52E-07 4.51E-07 30 5.38E-07 4.17E-07 4.12E-07 4.44E-07 4.52E-07 5.41E-07 5.28E-07 4.72E-07 5.14E-07 4.69E-07 4.49E-07 50 5.64E-07 4.36E-07 4.27E-07 4.58E-07 4.65E-07 5.70E-07 5.59E-07 5.02E-07 5.48E-07 4.98E-07 4.51E-07 60 5.59E-07 4.33E-07 4.26E-07 4.56E-07 4.64E-07 5.66E-07 5.56E-07 4.98E-07 5.42E-07 4.95E-07 4.50E-07 70 5.27E-07 4.14E-07 4.09E-07 4.40E-07 4.49E-07 5.25E-07 5.11E-07 4.60E-07 4.97E-07 4.57E-07 4.50E-07 4.10E-07 3.84E-08 5.15E-07 3.04E-07 4.53E-07 5.07E-08 5.92E-07 3.14E-07 4.42E-07 4.91E-08 5.77E-07 3.08E-07 4.53E-07 5.07E-08 5.92E-07 3.14E-07 4.70E-07 5.49E-08 6.20E-07 3.19E-07 4.68E-07 5.36E-08 6.14E-07 3.21E-07 4.47E-07 4.73E-08 5.77E-07 3.18E-07 4.17E-07 2.97E-08 4.98E-07 3.35E-07 -6.50E-07 PASS 6.50E-07 PASS 5.05E-07 3.28E-08 5.95E-07 4.15E-07 -7.00E-07 PASS 7.00E-07 PASS 4.86E-07 3.21E-08 5.74E-07 3.98E-07 -7.50E-07 PASS 7.50E-07 PASS 5.05E-07 3.28E-08 5.95E-07 4.15E-07 -7.50E-07 PASS 7.50E-07 PASS 5.36E-07 3.32E-08 6.27E-07 4.45E-07 -8.00E-07 PASS 8.00E-07 PASS 5.31E-07 3.31E-08 6.22E-07 4.41E-07 -8.00E-07 PASS 8.00E-07 PASS 4.90E-07 3.05E-08 5.73E-07 4.06E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 274 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=3V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.134. Plot of Negative Input Bias Current @ 3V, VCM=3V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 275 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.134. Raw data for Negative Input Bias Current @ 3V, VCM=3V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=3V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.36E-07 4.60E-07 4.19E-07 4.38E-07 4.59E-07 3.47E-07 4.19E-07 4.49E-07 4.17E-07 4.00E-07 3.91E-07 10 5.01E-07 5.04E-07 4.55E-07 4.75E-07 5.02E-07 4.27E-07 4.99E-07 5.38E-07 5.14E-07 4.86E-07 3.95E-07 20 4.90E-07 4.91E-07 4.47E-07 4.67E-07 4.94E-07 4.09E-07 4.81E-07 5.19E-07 4.95E-07 4.65E-07 3.91E-07 30 5.01E-07 5.04E-07 4.55E-07 4.75E-07 5.02E-07 4.27E-07 4.99E-07 5.38E-07 5.14E-07 4.86E-07 3.95E-07 50 5.25E-07 5.16E-07 4.72E-07 4.92E-07 5.16E-07 4.53E-07 5.29E-07 5.71E-07 5.50E-07 5.17E-07 3.94E-07 60 5.20E-07 5.14E-07 4.69E-07 4.90E-07 5.14E-07 4.52E-07 5.25E-07 5.67E-07 5.45E-07 5.13E-07 3.94E-07 70 4.90E-07 4.97E-07 4.53E-07 4.72E-07 4.96E-07 4.15E-07 4.82E-07 5.24E-07 4.98E-07 4.74E-07 3.95E-07 4.42E-07 1.69E-08 4.89E-07 3.96E-07 4.87E-07 2.17E-08 5.47E-07 4.28E-07 4.78E-07 2.04E-08 5.34E-07 4.22E-07 4.87E-07 2.17E-08 5.47E-07 4.28E-07 5.04E-07 2.18E-08 5.64E-07 4.44E-07 5.01E-07 2.15E-08 5.60E-07 4.42E-07 4.82E-07 1.91E-08 5.34E-07 4.29E-07 4.07E-07 3.73E-08 5.09E-07 3.04E-07 -6.50E-07 PASS 6.50E-07 PASS 4.93E-07 4.13E-08 6.06E-07 3.80E-07 -7.00E-07 PASS 7.00E-07 PASS 4.74E-07 4.11E-08 5.86E-07 3.61E-07 -7.50E-07 PASS 7.50E-07 PASS 4.93E-07 4.13E-08 6.06E-07 3.80E-07 -7.50E-07 PASS 7.50E-07 PASS 5.24E-07 4.47E-08 6.46E-07 4.01E-07 -8.00E-07 PASS 8.00E-07 PASS 5.20E-07 4.33E-08 6.39E-07 4.02E-07 -8.00E-07 PASS 8.00E-07 PASS 4.79E-07 4.04E-08 5.90E-07 3.68E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 276 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=3V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.135. Plot of Negative Input Bias Current @ 3V, VCM=3V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 277 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.135. Raw data for Negative Input Bias Current @ 3V, VCM=3V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=3V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.32E-07 4.60E-07 4.29E-07 4.37E-07 4.51E-07 3.58E-07 4.16E-07 4.51E-07 4.20E-07 3.91E-07 3.89E-07 10 4.93E-07 5.02E-07 4.65E-07 4.80E-07 4.94E-07 4.37E-07 4.96E-07 5.42E-07 5.14E-07 4.82E-07 3.89E-07 20 4.80E-07 4.94E-07 4.56E-07 4.70E-07 4.86E-07 4.19E-07 4.77E-07 5.24E-07 4.94E-07 4.64E-07 3.91E-07 30 4.93E-07 5.02E-07 4.65E-07 4.80E-07 4.94E-07 4.37E-07 4.96E-07 5.42E-07 5.14E-07 4.82E-07 3.89E-07 50 5.19E-07 5.20E-07 4.81E-07 4.97E-07 5.11E-07 4.65E-07 5.26E-07 5.75E-07 5.45E-07 5.16E-07 3.93E-07 60 5.15E-07 5.19E-07 4.78E-07 4.95E-07 5.09E-07 4.61E-07 5.23E-07 5.71E-07 5.42E-07 5.11E-07 3.90E-07 70 4.83E-07 4.99E-07 4.62E-07 4.73E-07 4.90E-07 4.26E-07 4.80E-07 5.28E-07 4.96E-07 4.70E-07 3.91E-07 4.42E-07 1.32E-08 4.78E-07 4.06E-07 4.87E-07 1.45E-08 5.27E-07 4.47E-07 4.77E-07 1.47E-08 5.18E-07 4.37E-07 4.87E-07 1.45E-08 5.27E-07 4.47E-07 5.06E-07 1.66E-08 5.51E-07 4.60E-07 5.03E-07 1.67E-08 5.49E-07 4.57E-07 4.81E-07 1.43E-08 5.21E-07 4.42E-07 4.07E-07 3.49E-08 5.03E-07 3.12E-07 -6.50E-07 PASS 6.50E-07 PASS 4.94E-07 3.92E-08 6.02E-07 3.87E-07 -7.00E-07 PASS 7.00E-07 PASS 4.76E-07 3.89E-08 5.83E-07 3.69E-07 -7.50E-07 PASS 7.50E-07 PASS 4.94E-07 3.92E-08 6.02E-07 3.87E-07 -7.50E-07 PASS 7.50E-07 PASS 5.25E-07 4.06E-08 6.37E-07 4.14E-07 -8.00E-07 PASS 8.00E-07 PASS 5.22E-07 4.10E-08 6.34E-07 4.09E-07 -8.00E-07 PASS 8.00E-07 PASS 4.80E-07 3.74E-08 5.83E-07 3.78E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 278 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 3V, VCM=3V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.136. Plot of Negative Input Bias Current @ 3V, VCM=3V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 279 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.136. Raw data for Negative Input Bias Current @ 3V, VCM=3V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 3V, VCM=3V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.70E-07 3.79E-07 3.78E-07 4.23E-07 4.23E-07 4.46E-07 4.12E-07 3.85E-07 4.11E-07 3.87E-07 4.48E-07 10 5.33E-07 4.22E-07 4.15E-07 4.55E-07 4.57E-07 5.32E-07 5.02E-07 4.70E-07 5.04E-07 4.67E-07 4.49E-07 20 5.20E-07 4.13E-07 4.09E-07 4.48E-07 4.50E-07 5.11E-07 4.84E-07 4.51E-07 4.84E-07 4.50E-07 4.51E-07 30 5.33E-07 4.22E-07 4.15E-07 4.55E-07 4.57E-07 5.32E-07 5.02E-07 4.70E-07 5.04E-07 4.67E-07 4.49E-07 50 5.59E-07 4.41E-07 4.32E-07 4.70E-07 4.71E-07 5.62E-07 5.35E-07 5.00E-07 5.34E-07 4.98E-07 4.50E-07 60 5.56E-07 4.39E-07 4.28E-07 4.67E-07 4.68E-07 5.56E-07 5.29E-07 4.96E-07 5.30E-07 4.92E-07 4.50E-07 70 5.24E-07 4.19E-07 4.11E-07 4.52E-07 4.52E-07 5.15E-07 4.84E-07 4.56E-07 4.86E-07 4.56E-07 4.50E-07 4.15E-07 3.81E-08 5.19E-07 3.10E-07 4.56E-07 4.69E-08 5.85E-07 3.28E-07 4.48E-07 4.43E-08 5.69E-07 3.26E-07 4.56E-07 4.69E-08 5.85E-07 3.28E-07 4.74E-07 5.02E-08 6.12E-07 3.37E-07 4.72E-07 5.00E-08 6.09E-07 3.34E-07 4.52E-07 4.47E-08 5.74E-07 3.29E-07 4.08E-07 2.46E-08 4.75E-07 3.41E-07 -6.50E-07 PASS 6.50E-07 PASS 4.95E-07 2.68E-08 5.69E-07 4.21E-07 -7.00E-07 PASS 7.00E-07 PASS 4.76E-07 2.57E-08 5.47E-07 4.06E-07 -7.50E-07 PASS 7.50E-07 PASS 4.95E-07 2.68E-08 5.69E-07 4.21E-07 -7.50E-07 PASS 7.50E-07 PASS 5.26E-07 2.71E-08 6.00E-07 4.51E-07 -8.00E-07 PASS 8.00E-07 PASS 5.21E-07 2.65E-08 5.93E-07 4.48E-07 -8.00E-07 PASS 8.00E-07 PASS 4.80E-07 2.46E-08 5.47E-07 4.12E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 280 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #1 (V/mV) 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.137. Plot of Large Signal Voltage Gain @ 3V #1 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 281 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.137. Raw data for Large Signal Voltage Gain @ 3V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #1 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.38E+03 1.46E+03 2.08E+03 1.44E+03 1.71E+03 1.54E+03 1.35E+03 1.29E+03 1.27E+03 1.37E+03 1.67E+03 10 1.28E+03 1.52E+03 1.56E+03 1.05E+03 1.43E+03 1.32E+03 1.21E+03 1.34E+03 1.30E+03 1.66E+03 1.55E+03 20 1.16E+03 1.60E+03 1.58E+03 1.24E+03 1.57E+03 1.36E+03 1.09E+03 1.78E+03 1.25E+03 1.65E+03 1.52E+03 30 1.28E+03 1.52E+03 1.56E+03 1.05E+03 1.43E+03 1.32E+03 1.21E+03 1.34E+03 1.30E+03 1.66E+03 1.55E+03 50 8.87E+02 1.18E+03 1.32E+03 7.31E+02 1.14E+03 1.78E+03 1.37E+03 1.48E+03 1.21E+03 1.23E+03 1.49E+03 60 8.33E+02 1.10E+03 1.39E+03 8.51E+02 1.12E+03 1.18E+03 1.23E+03 1.38E+03 1.20E+03 1.25E+03 1.71E+03 70 1.14E+03 1.45E+03 1.52E+03 1.25E+03 1.52E+03 1.44E+03 1.40E+03 1.51E+03 1.10E+03 1.22E+03 1.42E+03 1.61E+03 2.91E+02 2.41E+03 8.15E+02 1.37E+03 2.06E+02 1.93E+03 8.01E+02 1.43E+03 2.11E+02 2.01E+03 8.53E+02 1.37E+03 2.06E+02 1.93E+03 8.01E+02 1.05E+03 2.40E+02 1.71E+03 3.96E+02 1.06E+03 2.30E+02 1.69E+03 4.28E+02 1.38E+03 1.73E+02 1.85E+03 9.01E+02 1.36E+03 1.07E+02 1.65E+03 1.07E+03 5.00E+02 PASS 1.36E+03 1.73E+02 1.84E+03 8.91E+02 3.00E+02 PASS 1.43E+03 2.83E+02 2.20E+03 6.49E+02 3.00E+02 PASS 1.36E+03 1.73E+02 1.84E+03 8.91E+02 3.00E+02 PASS 1.41E+03 2.34E+02 2.06E+03 7.72E+02 3.00E+02 PASS 1.25E+03 7.82E+01 1.46E+03 1.03E+03 3.00E+02 PASS 1.33E+03 1.67E+02 1.79E+03 8.75E+02 3.00E+02 PASS An ISO 9001:2000 Certified Company 282 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #2 (V/mV) 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.138. Plot of Large Signal Voltage Gain @ 3V #2 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 283 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.138. Raw data for Large Signal Voltage Gain @ 3V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #2 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.28E+03 1.45E+03 1.57E+03 1.63E+03 1.48E+03 1.91E+03 1.45E+03 1.77E+03 1.58E+03 1.47E+03 1.50E+03 10 1.31E+03 1.25E+03 1.09E+03 1.30E+03 1.28E+03 1.68E+03 2.07E+03 1.75E+03 1.52E+03 1.50E+03 1.92E+03 20 1.17E+03 1.30E+03 1.34E+03 1.43E+03 1.14E+03 1.32E+03 1.27E+03 9.69E+02 1.32E+03 1.14E+03 1.79E+03 30 1.31E+03 1.25E+03 1.09E+03 1.30E+03 1.28E+03 1.68E+03 2.07E+03 1.75E+03 1.52E+03 1.50E+03 1.92E+03 50 7.99E+02 7.65E+02 7.67E+02 7.26E+02 7.73E+02 2.26E+03 1.22E+03 1.48E+03 1.35E+03 1.45E+03 1.55E+03 60 8.41E+02 8.72E+02 7.38E+02 6.41E+02 8.04E+02 1.99E+03 2.97E+03 1.67E+03 1.68E+03 1.62E+03 1.36E+03 70 1.02E+03 1.29E+03 1.21E+03 1.63E+03 1.25E+03 1.76E+03 1.48E+03 1.48E+03 1.61E+03 2.55E+03 1.85E+03 1.48E+03 1.37E+02 1.86E+03 1.11E+03 1.24E+03 8.90E+01 1.49E+03 9.99E+02 1.28E+03 1.20E+02 1.61E+03 9.48E+02 1.24E+03 8.90E+01 1.49E+03 9.99E+02 7.66E+02 2.62E+01 8.38E+02 6.94E+02 7.79E+02 9.20E+01 1.03E+03 5.27E+02 1.28E+03 2.22E+02 1.89E+03 6.69E+02 1.63E+03 1.97E+02 2.18E+03 1.09E+03 5.00E+02 PASS 1.70E+03 2.29E+02 2.33E+03 1.08E+03 3.00E+02 PASS 1.20E+03 1.49E+02 1.61E+03 7.93E+02 3.00E+02 PASS 1.70E+03 2.29E+02 2.33E+03 1.08E+03 3.00E+02 PASS 1.55E+03 4.07E+02 2.67E+03 4.34E+02 3.00E+02 PASS 1.99E+03 5.70E+02 3.55E+03 4.23E+02 3.00E+02 PASS 1.78E+03 4.49E+02 3.01E+03 5.46E+02 3.00E+02 PASS An ISO 9001:2000 Certified Company 284 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #3 (V/mV) 2.00E+03 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.139. Plot of Large Signal Voltage Gain @ 3V #3 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 285 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.139. Raw data for Large Signal Voltage Gain @ 3V #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #3 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.60E+03 1.70E+03 1.72E+03 2.34E+03 1.54E+03 1.47E+03 1.25E+03 1.56E+03 1.62E+03 1.45E+03 1.54E+03 10 1.03E+03 1.59E+03 1.23E+03 1.34E+03 1.79E+03 1.38E+03 1.33E+03 1.20E+03 1.68E+03 1.32E+03 1.66E+03 20 1.60E+03 1.36E+03 1.39E+03 1.12E+03 1.57E+03 1.40E+03 1.46E+03 1.53E+03 1.41E+03 1.36E+03 1.50E+03 30 1.03E+03 1.59E+03 1.23E+03 1.34E+03 1.79E+03 1.38E+03 1.33E+03 1.20E+03 1.68E+03 1.32E+03 1.66E+03 50 1.06E+03 1.01E+03 9.79E+02 6.47E+02 8.80E+02 1.82E+03 1.20E+03 1.48E+03 1.15E+03 1.27E+03 1.66E+03 60 9.88E+02 1.13E+03 7.92E+02 6.03E+02 1.03E+03 1.54E+03 1.01E+03 1.25E+03 1.85E+03 1.69E+03 1.44E+03 70 1.81E+03 1.67E+03 1.34E+03 1.43E+03 1.14E+03 1.31E+03 1.08E+03 1.29E+03 1.38E+03 1.37E+03 1.57E+03 1.78E+03 3.20E+02 2.66E+03 9.00E+02 1.40E+03 3.01E+02 2.22E+03 5.71E+02 1.41E+03 1.93E+02 1.93E+03 8.79E+02 1.40E+03 3.01E+02 2.22E+03 5.71E+02 9.15E+02 1.64E+02 1.36E+03 4.66E+02 9.09E+02 2.11E+02 1.49E+03 3.31E+02 1.48E+03 2.67E+02 2.21E+03 7.46E+02 1.47E+03 1.40E+02 1.85E+03 1.09E+03 5.00E+02 PASS 1.38E+03 1.78E+02 1.87E+03 8.96E+02 3.00E+02 PASS 1.43E+03 6.49E+01 1.61E+03 1.25E+03 3.00E+02 PASS 1.38E+03 1.78E+02 1.87E+03 8.96E+02 3.00E+02 PASS 1.38E+03 2.74E+02 2.13E+03 6.32E+02 3.00E+02 PASS 1.47E+03 3.41E+02 2.40E+03 5.33E+02 3.00E+02 PASS 1.29E+03 1.21E+02 1.62E+03 9.55E+02 3.00E+02 PASS An ISO 9001:2000 Certified Company 286 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #4 (V/mV) 1.80E+03 1.60E+03 1.40E+03 1.20E+03 1.00E+03 8.00E+02 6.00E+02 4.00E+02 2.00E+02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.140. Plot of Large Signal Voltage Gain @ 3V #4 (V/mV) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 287 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.140. Raw data for Large Signal Voltage Gain @ 3V #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #4 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.40E+03 1.58E+03 1.91E+03 1.39E+03 1.42E+03 1.37E+03 1.48E+03 1.43E+03 1.70E+03 1.75E+03 1.92E+03 10 1.10E+03 1.15E+03 1.21E+03 1.28E+03 1.09E+03 1.30E+03 1.29E+03 1.20E+03 1.43E+03 1.46E+03 1.52E+03 20 1.29E+03 1.20E+03 1.20E+03 1.12E+03 1.25E+03 1.28E+03 1.48E+03 1.32E+03 1.59E+03 1.28E+03 1.67E+03 30 1.10E+03 1.15E+03 1.21E+03 1.28E+03 1.09E+03 1.30E+03 1.29E+03 1.20E+03 1.43E+03 1.46E+03 1.52E+03 50 1.07E+03 8.38E+02 6.76E+02 1.08E+03 1.01E+03 1.21E+03 1.26E+03 1.56E+03 1.50E+03 1.38E+03 1.47E+03 60 9.41E+02 8.80E+02 1.54E+03 1.07E+03 9.37E+02 1.59E+03 1.59E+03 1.41E+03 1.35E+03 1.31E+03 1.61E+03 70 1.02E+03 1.21E+03 1.27E+03 1.33E+03 1.19E+03 1.34E+03 1.34E+03 1.28E+03 1.26E+03 1.30E+03 1.53E+03 1.54E+03 2.22E+02 2.15E+03 9.31E+02 1.17E+03 8.02E+01 1.39E+03 9.46E+02 1.21E+03 6.49E+01 1.39E+03 1.03E+03 1.17E+03 8.02E+01 1.39E+03 9.46E+02 9.36E+02 1.76E+02 1.42E+03 4.55E+02 1.07E+03 2.71E+02 1.82E+03 3.30E+02 1.21E+03 1.18E+02 1.53E+03 8.80E+02 1.55E+03 1.69E+02 2.01E+03 1.08E+03 5.00E+02 PASS 1.34E+03 1.09E+02 1.64E+03 1.04E+03 3.00E+02 PASS 1.39E+03 1.41E+02 1.78E+03 1.00E+03 3.00E+02 PASS 1.34E+03 1.09E+02 1.64E+03 1.04E+03 3.00E+02 PASS 1.38E+03 1.51E+02 1.80E+03 9.67E+02 3.00E+02 PASS 1.45E+03 1.32E+02 1.81E+03 1.09E+03 3.00E+02 PASS 1.30E+03 3.76E+01 1.41E+03 1.20E+03 3.00E+02 PASS An ISO 9001:2000 Certified Company 288 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #1 (dB) 1.26E+02 1.24E+02 1.22E+02 1.20E+02 1.18E+02 1.16E+02 1.14E+02 1.12E+02 1.10E+02 1.08E+02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.141. Plot of Large Signal Voltage Gain @ 3V #1 (dB) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 289 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.141. Raw data for Large Signal Voltage Gain @ 3V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). 0 1.23E+02 1.23E+02 1.26E+02 1.23E+02 1.25E+02 1.24E+02 1.23E+02 1.22E+02 1.22E+02 1.23E+02 1.24E+02 10 1.22E+02 1.24E+02 1.24E+02 1.20E+02 1.23E+02 1.22E+02 1.22E+02 1.23E+02 1.22E+02 1.24E+02 1.24E+02 20 1.21E+02 1.24E+02 1.24E+02 1.22E+02 1.24E+02 1.23E+02 1.21E+02 1.25E+02 1.22E+02 1.24E+02 1.24E+02 30 1.22E+02 1.24E+02 1.24E+02 1.20E+02 1.23E+02 1.22E+02 1.22E+02 1.23E+02 1.22E+02 1.24E+02 1.24E+02 50 1.19E+02 1.21E+02 1.22E+02 1.17E+02 1.21E+02 1.25E+02 1.23E+02 1.23E+02 1.22E+02 1.22E+02 1.23E+02 24 hr Anneal 60 1.18E+02 1.21E+02 1.23E+02 1.19E+02 1.21E+02 1.21E+02 1.22E+02 1.23E+02 1.22E+02 1.22E+02 1.25E+02 1.24E+02 1.48E+00 1.28E+02 1.20E+02 1.23E+02 1.39E+00 1.26E+02 1.19E+02 1.23E+02 1.33E+00 1.27E+02 1.19E+02 1.23E+02 1.39E+00 1.26E+02 1.19E+02 1.20E+02 2.10E+00 1.26E+02 1.15E+02 1.20E+02 1.86E+00 1.25E+02 1.15E+02 1.23E+02 1.13E+00 1.26E+02 1.20E+02 1.23E+02 6.60E-01 1.24E+02 1.21E+02 1.14E+02 PASS 1.23E+02 1.04E+00 1.25E+02 1.20E+02 1.10E+02 PASS 1.23E+02 1.73E+00 1.28E+02 1.18E+02 1.10E+02 PASS 1.23E+02 1.04E+00 1.25E+02 1.20E+02 1.10E+02 PASS 1.23E+02 1.38E+00 1.27E+02 1.19E+02 1.10E+02 PASS 1.22E+02 5.29E-01 1.23E+02 1.20E+02 1.10E+02 PASS 1.22E+02 1.12E+00 1.26E+02 1.19E+02 1.10E+02 PASS Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status An ISO 9001:2000 Certified Company 290 168 hr Anneal 70 1.21E+02 1.23E+02 1.24E+02 1.22E+02 1.24E+02 1.23E+02 1.23E+02 1.24E+02 1.21E+02 1.22E+02 1.23E+02 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #2 (dB) 1.28E+02 1.26E+02 1.24E+02 1.22E+02 1.20E+02 1.18E+02 1.16E+02 1.14E+02 1.12E+02 1.10E+02 1.08E+02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.142. Plot of Large Signal Voltage Gain @ 3V #2 (dB) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 291 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.142. Raw data for Large Signal Voltage Gain @ 3V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). 0 1.22E+02 1.23E+02 1.24E+02 1.24E+02 1.23E+02 1.26E+02 1.23E+02 1.25E+02 1.24E+02 1.23E+02 1.24E+02 10 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.22E+02 1.25E+02 1.26E+02 1.25E+02 1.24E+02 1.24E+02 1.26E+02 20 1.21E+02 1.22E+02 1.23E+02 1.23E+02 1.21E+02 1.22E+02 1.22E+02 1.20E+02 1.22E+02 1.21E+02 1.25E+02 30 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.22E+02 1.25E+02 1.26E+02 1.25E+02 1.24E+02 1.24E+02 1.26E+02 50 1.18E+02 1.18E+02 1.18E+02 1.17E+02 1.18E+02 1.27E+02 1.22E+02 1.23E+02 1.23E+02 1.23E+02 1.24E+02 24 hr Anneal 60 1.18E+02 1.19E+02 1.17E+02 1.16E+02 1.18E+02 1.26E+02 1.29E+02 1.24E+02 1.25E+02 1.24E+02 1.23E+02 1.23E+02 8.23E-01 1.26E+02 1.21E+02 1.22E+02 6.50E-01 1.24E+02 1.20E+02 1.22E+02 8.18E-01 1.24E+02 1.20E+02 1.22E+02 6.50E-01 1.24E+02 1.20E+02 1.18E+02 2.99E-01 1.19E+02 1.17E+02 1.18E+02 1.07E+00 1.21E+02 1.15E+02 1.22E+02 1.47E+00 1.26E+02 1.18E+02 1.24E+02 1.03E+00 1.27E+02 1.21E+02 1.14E+02 PASS 1.25E+02 1.12E+00 1.28E+02 1.21E+02 1.10E+02 PASS 1.22E+02 1.13E+00 1.25E+02 1.18E+02 1.10E+02 PASS 1.25E+02 1.12E+00 1.28E+02 1.21E+02 1.10E+02 PASS 1.24E+02 2.05E+00 1.29E+02 1.18E+02 1.10E+02 PASS 1.26E+02 2.21E+00 1.32E+02 1.20E+02 1.10E+02 PASS 1.25E+02 1.97E+00 1.30E+02 1.19E+02 1.10E+02 PASS Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status An ISO 9001:2000 Certified Company 292 168 hr Anneal 70 1.20E+02 1.22E+02 1.22E+02 1.24E+02 1.22E+02 1.25E+02 1.23E+02 1.23E+02 1.24E+02 1.28E+02 1.25E+02 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #3 (dB) 1.26E+02 1.24E+02 1.22E+02 1.20E+02 1.18E+02 1.16E+02 1.14E+02 1.12E+02 1.10E+02 1.08E+02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.143. Plot of Large Signal Voltage Gain @ 3V #3 (dB) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 293 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.143. Raw data for Large Signal Voltage Gain @ 3V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). 0 1.24E+02 1.25E+02 1.25E+02 1.27E+02 1.24E+02 1.23E+02 1.22E+02 1.24E+02 1.24E+02 1.23E+02 1.24E+02 10 1.20E+02 1.24E+02 1.22E+02 1.23E+02 1.25E+02 1.23E+02 1.22E+02 1.22E+02 1.25E+02 1.22E+02 1.24E+02 20 1.24E+02 1.23E+02 1.23E+02 1.21E+02 1.24E+02 1.23E+02 1.23E+02 1.24E+02 1.23E+02 1.23E+02 1.24E+02 30 1.20E+02 1.24E+02 1.22E+02 1.23E+02 1.25E+02 1.23E+02 1.22E+02 1.22E+02 1.25E+02 1.22E+02 1.24E+02 50 1.21E+02 1.20E+02 1.20E+02 1.16E+02 1.19E+02 1.25E+02 1.22E+02 1.23E+02 1.21E+02 1.22E+02 1.24E+02 24 hr Anneal 60 1.20E+02 1.21E+02 1.18E+02 1.16E+02 1.20E+02 1.24E+02 1.20E+02 1.22E+02 1.25E+02 1.25E+02 1.23E+02 1.25E+02 1.44E+00 1.29E+02 1.21E+02 1.23E+02 1.89E+00 1.28E+02 1.18E+02 1.23E+02 1.25E+00 1.26E+02 1.19E+02 1.23E+02 1.89E+00 1.28E+02 1.18E+02 1.19E+02 1.72E+00 1.24E+02 1.14E+02 1.19E+02 2.19E+00 1.25E+02 1.13E+02 1.23E+02 1.59E+00 1.28E+02 1.19E+02 1.23E+02 8.60E-01 1.26E+02 1.21E+02 1.14E+02 PASS 1.23E+02 1.07E+00 1.26E+02 1.20E+02 1.10E+02 PASS 1.23E+02 3.90E-01 1.24E+02 1.22E+02 1.10E+02 PASS 1.23E+02 1.07E+00 1.26E+02 1.20E+02 1.10E+02 PASS 1.23E+02 1.63E+00 1.27E+02 1.18E+02 1.10E+02 PASS 1.23E+02 2.14E+00 1.29E+02 1.17E+02 1.10E+02 PASS 1.22E+02 8.61E-01 1.25E+02 1.20E+02 1.10E+02 PASS Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status An ISO 9001:2000 Certified Company 294 168 hr Anneal 70 1.25E+02 1.24E+02 1.23E+02 1.23E+02 1.21E+02 1.22E+02 1.21E+02 1.22E+02 1.23E+02 1.23E+02 1.24E+02 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 3V #4 (dB) 1.26E+02 1.24E+02 1.22E+02 1.20E+02 1.18E+02 1.16E+02 1.14E+02 1.12E+02 1.10E+02 1.08E+02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.144. Plot of Large Signal Voltage Gain @ 3V #4 (dB) versus total dose. The data show some degradation with radiation, however it is not sufficient for any of the units-under-test to exceed specification. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 295 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.144. Raw data for Large Signal Voltage Gain @ 3V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). 0 1.23E+02 1.24E+02 1.26E+02 1.23E+02 1.23E+02 1.23E+02 1.23E+02 1.23E+02 1.25E+02 1.25E+02 1.26E+02 10 1.21E+02 1.21E+02 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.22E+02 1.22E+02 1.23E+02 1.23E+02 1.24E+02 20 1.22E+02 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.22E+02 1.23E+02 1.22E+02 1.24E+02 1.22E+02 1.24E+02 30 1.21E+02 1.21E+02 1.22E+02 1.22E+02 1.21E+02 1.22E+02 1.22E+02 1.22E+02 1.23E+02 1.23E+02 1.24E+02 50 1.21E+02 1.18E+02 1.17E+02 1.21E+02 1.20E+02 1.22E+02 1.22E+02 1.24E+02 1.24E+02 1.23E+02 1.23E+02 24 hr Anneal 60 1.19E+02 1.19E+02 1.24E+02 1.21E+02 1.19E+02 1.24E+02 1.24E+02 1.23E+02 1.23E+02 1.22E+02 1.24E+02 1.24E+02 1.18E+00 1.27E+02 1.20E+02 1.21E+02 5.91E-01 1.23E+02 1.20E+02 1.22E+02 4.70E-01 1.23E+02 1.20E+02 1.21E+02 5.91E-01 1.23E+02 1.20E+02 1.19E+02 1.75E+00 1.24E+02 1.14E+02 1.20E+02 1.96E+00 1.26E+02 1.15E+02 1.22E+02 8.88E-01 1.24E+02 1.19E+02 1.24E+02 9.43E-01 1.26E+02 1.21E+02 1.14E+02 PASS 1.23E+02 7.07E-01 1.24E+02 1.21E+02 1.10E+02 PASS 1.23E+02 8.60E-01 1.25E+02 1.20E+02 1.10E+02 PASS 1.23E+02 7.07E-01 1.24E+02 1.21E+02 1.10E+02 PASS 1.23E+02 9.52E-01 1.25E+02 1.20E+02 1.10E+02 PASS 1.23E+02 7.89E-01 1.25E+02 1.21E+02 1.10E+02 PASS 1.22E+02 2.51E-01 1.23E+02 1.22E+02 1.10E+02 PASS Total Dose (krad(Si)) Large Signal Voltage Gain @ 3V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status An ISO 9001:2000 Certified Company 296 168 hr Anneal 70 1.20E+02 1.22E+02 1.22E+02 1.22E+02 1.22E+02 1.23E+02 1.23E+02 1.22E+02 1.22E+02 1.22E+02 1.24E+02 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ 3V #1 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.145. Plot of Common Mode Rejection Ratio @ 3V #1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 297 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.145. Raw data for Common Mode Rejection Ratio @ 3V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 3V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 7.89E+01 1.02E+02 8.11E+01 8.64E+01 1.05E+02 8.31E+01 8.30E+01 8.91E+01 8.00E+01 9.01E+01 9.57E+01 10 7.93E+01 1.00E+02 8.09E+01 8.65E+01 1.02E+02 8.27E+01 8.29E+01 9.00E+01 7.97E+01 9.12E+01 9.53E+01 20 7.92E+01 1.00E+02 8.10E+01 8.65E+01 1.00E+02 8.29E+01 8.29E+01 9.00E+01 7.98E+01 9.12E+01 9.51E+01 30 7.93E+01 1.00E+02 8.09E+01 8.65E+01 1.02E+02 8.27E+01 8.29E+01 9.00E+01 7.97E+01 9.12E+01 9.53E+01 50 7.94E+01 1.00E+02 8.09E+01 8.66E+01 1.02E+02 8.27E+01 8.29E+01 8.99E+01 7.97E+01 9.14E+01 9.54E+01 60 7.94E+01 1.00E+02 8.09E+01 8.66E+01 1.03E+02 8.27E+01 8.29E+01 9.00E+01 7.97E+01 9.13E+01 9.56E+01 70 7.97E+01 1.01E+02 8.09E+01 8.71E+01 9.79E+01 8.35E+01 8.26E+01 9.03E+01 7.98E+01 9.52E+01 9.53E+01 9.07E+01 1.20E+01 1.24E+02 5.77E+01 8.97E+01 1.06E+01 1.19E+02 6.06E+01 8.94E+01 1.02E+01 1.17E+02 6.15E+01 8.97E+01 1.06E+01 1.19E+02 6.06E+01 8.98E+01 1.06E+01 1.19E+02 6.07E+01 9.00E+01 1.09E+01 1.20E+02 6.01E+01 8.92E+01 9.59E+00 1.16E+02 6.30E+01 8.51E+01 4.33E+00 9.69E+01 7.32E+01 7.20E+01 FAIL 8.53E+01 5.01E+00 9.90E+01 7.16E+01 7.00E+01 FAIL 8.53E+01 4.98E+00 9.90E+01 7.17E+01 7.00E+01 FAIL 8.53E+01 5.01E+00 9.90E+01 7.16E+01 7.00E+01 FAIL 8.53E+01 5.06E+00 9.92E+01 7.14E+01 7.00E+01 FAIL 8.53E+01 5.02E+00 9.91E+01 7.15E+01 7.00E+01 FAIL 8.63E+01 6.31E+00 1.04E+02 6.90E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 298 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio @ 3V #2 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.146. Plot of Common Mode Rejection Ratio @ 3V #2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 299 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.146. Raw data for Common Mode Rejection Ratio @ 3V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 3V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.46E+01 8.46E+01 8.52E+01 7.75E+01 8.17E+01 7.95E+01 8.48E+01 1.34E+02 8.45E+01 8.57E+01 9.18E+01 10 9.61E+01 8.45E+01 8.54E+01 7.78E+01 8.16E+01 7.93E+01 8.42E+01 1.12E+02 8.44E+01 8.55E+01 9.21E+01 20 9.59E+01 8.46E+01 8.54E+01 7.77E+01 8.16E+01 7.93E+01 8.43E+01 1.15E+02 8.46E+01 8.55E+01 9.21E+01 30 9.61E+01 8.45E+01 8.54E+01 7.78E+01 8.16E+01 7.93E+01 8.42E+01 1.12E+02 8.44E+01 8.55E+01 9.21E+01 50 9.67E+01 8.43E+01 8.54E+01 7.79E+01 8.15E+01 7.92E+01 8.41E+01 1.13E+02 8.43E+01 8.54E+01 9.21E+01 60 9.68E+01 8.43E+01 8.55E+01 7.79E+01 8.16E+01 7.93E+01 8.41E+01 1.14E+02 8.45E+01 8.53E+01 9.19E+01 70 9.42E+01 8.52E+01 8.45E+01 7.76E+01 8.23E+01 7.95E+01 8.43E+01 1.17E+02 8.45E+01 8.62E+01 9.23E+01 8.47E+01 6.29E+00 1.02E+02 6.74E+01 8.51E+01 6.85E+00 1.04E+02 6.63E+01 8.50E+01 6.75E+00 1.04E+02 6.65E+01 8.51E+01 6.85E+00 1.04E+02 6.63E+01 8.52E+01 7.05E+00 1.05E+02 6.58E+01 8.52E+01 7.12E+00 1.05E+02 6.57E+01 8.48E+01 6.04E+00 1.01E+02 6.82E+01 9.38E+01 2.28E+01 1.56E+02 3.13E+01 7.20E+01 FAIL 8.91E+01 1.32E+01 1.25E+02 5.31E+01 7.00E+01 FAIL 8.98E+01 1.45E+01 1.30E+02 5.01E+01 7.00E+01 FAIL 8.91E+01 1.32E+01 1.25E+02 5.31E+01 7.00E+01 FAIL 8.91E+01 1.33E+01 1.26E+02 5.26E+01 7.00E+01 FAIL 8.94E+01 1.38E+01 1.27E+02 5.15E+01 7.00E+01 FAIL 9.03E+01 1.52E+01 1.32E+02 4.86E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 300 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ 3V #3 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.147. Plot of Common Mode Rejection Ratio @ 3V #3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 301 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.147. Raw data for Common Mode Rejection Ratio @ 3V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 3V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.79E+01 7.96E+01 7.84E+01 8.03E+01 9.48E+01 8.73E+01 9.21E+01 7.72E+01 8.64E+01 8.05E+01 7.84E+01 10 8.66E+01 7.99E+01 7.87E+01 8.02E+01 9.37E+01 8.66E+01 9.13E+01 7.71E+01 8.61E+01 8.06E+01 7.85E+01 20 8.68E+01 7.99E+01 7.87E+01 8.02E+01 9.40E+01 8.67E+01 9.15E+01 7.72E+01 8.62E+01 8.05E+01 7.84E+01 30 8.66E+01 7.99E+01 7.87E+01 8.02E+01 9.37E+01 8.66E+01 9.13E+01 7.71E+01 8.61E+01 8.06E+01 7.85E+01 50 8.64E+01 8.01E+01 7.90E+01 8.01E+01 9.32E+01 8.65E+01 9.12E+01 7.72E+01 8.61E+01 8.06E+01 7.84E+01 60 8.64E+01 8.01E+01 7.90E+01 8.01E+01 9.35E+01 8.65E+01 9.14E+01 7.72E+01 8.61E+01 8.06E+01 7.84E+01 70 8.61E+01 8.03E+01 7.86E+01 7.99E+01 9.16E+01 8.75E+01 9.15E+01 7.73E+01 8.63E+01 8.07E+01 7.85E+01 8.42E+01 7.02E+00 1.03E+02 6.50E+01 8.38E+01 6.31E+00 1.01E+02 6.65E+01 8.39E+01 6.45E+00 1.02E+02 6.62E+01 8.38E+01 6.31E+00 1.01E+02 6.65E+01 8.38E+01 6.03E+00 1.00E+02 6.72E+01 8.38E+01 6.15E+00 1.01E+02 6.70E+01 8.33E+01 5.46E+00 9.83E+01 6.83E+01 8.47E+01 5.89E+00 1.01E+02 6.86E+01 7.20E+01 FAIL 8.43E+01 5.54E+00 9.95E+01 6.92E+01 7.00E+01 FAIL 8.44E+01 5.62E+00 9.98E+01 6.90E+01 7.00E+01 FAIL 8.43E+01 5.54E+00 9.95E+01 6.92E+01 7.00E+01 FAIL 8.43E+01 5.49E+00 9.94E+01 6.93E+01 7.00E+01 FAIL 8.43E+01 5.56E+00 9.96E+01 6.91E+01 7.00E+01 FAIL 8.46E+01 5.65E+00 1.00E+02 6.91E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 302 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Common Mode Rejection Ratio @ 3V #4 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.148. Plot of Common Mode Rejection Ratio @ 3V #4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 303 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.148. Raw data for Common Mode Rejection Ratio @ 3V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 3V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.96E+01 8.87E+01 8.41E+01 8.87E+01 1.05E+02 8.46E+01 8.09E+01 7.88E+01 8.02E+01 8.77E+01 9.06E+01 10 9.64E+01 8.85E+01 8.42E+01 8.80E+01 1.14E+02 8.43E+01 8.09E+01 7.84E+01 8.00E+01 8.72E+01 9.06E+01 20 9.65E+01 8.86E+01 8.42E+01 8.82E+01 1.12E+02 8.43E+01 8.09E+01 7.85E+01 8.00E+01 8.73E+01 9.04E+01 30 9.64E+01 8.85E+01 8.42E+01 8.80E+01 1.14E+02 8.43E+01 8.09E+01 7.84E+01 8.00E+01 8.72E+01 9.06E+01 50 9.59E+01 8.87E+01 8.42E+01 8.79E+01 1.19E+02 8.42E+01 8.09E+01 7.83E+01 7.99E+01 8.72E+01 9.06E+01 60 9.61E+01 8.87E+01 8.41E+01 8.79E+01 1.15E+02 8.42E+01 8.09E+01 7.84E+01 7.99E+01 8.72E+01 9.07E+01 70 9.52E+01 8.84E+01 8.33E+01 8.80E+01 1.26E+02 8.43E+01 8.03E+01 7.83E+01 7.98E+01 8.77E+01 9.05E+01 9.33E+01 8.80E+00 1.17E+02 6.92E+01 9.42E+01 1.18E+01 1.27E+02 6.17E+01 9.39E+01 1.10E+01 1.24E+02 6.38E+01 9.42E+01 1.18E+01 1.27E+02 6.17E+01 9.52E+01 1.42E+01 1.34E+02 5.64E+01 9.43E+01 1.22E+01 1.28E+02 6.09E+01 9.61E+01 1.70E+01 1.43E+02 4.94E+01 8.24E+01 3.65E+00 9.25E+01 7.24E+01 7.20E+01 FAIL 8.22E+01 3.55E+00 9.19E+01 7.24E+01 7.00E+01 FAIL 8.22E+01 3.55E+00 9.20E+01 7.25E+01 7.00E+01 FAIL 8.22E+01 3.55E+00 9.19E+01 7.24E+01 7.00E+01 FAIL 8.21E+01 3.58E+00 9.19E+01 7.23E+01 7.00E+01 FAIL 8.21E+01 3.56E+00 9.19E+01 7.24E+01 7.00E+01 FAIL 8.21E+01 3.84E+00 9.26E+01 7.15E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 304 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.149. Plot of Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 305 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.149. Raw data for Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 7.98E+01 9.07E+01 9.17E+01 9.92E+01 9.89E+01 9.87E+01 9.44E+01 7.65E+01 1.16E+02 8.28E+01 9.76E+01 10 8.06E+01 9.12E+01 9.10E+01 1.03E+02 9.99E+01 9.85E+01 9.48E+01 7.64E+01 1.10E+02 8.30E+01 9.80E+01 20 8.05E+01 9.12E+01 9.12E+01 1.01E+02 9.81E+01 9.89E+01 9.48E+01 7.64E+01 1.11E+02 8.30E+01 9.79E+01 30 8.06E+01 9.12E+01 9.10E+01 1.03E+02 9.99E+01 9.85E+01 9.48E+01 7.64E+01 1.10E+02 8.30E+01 9.80E+01 50 8.08E+01 9.14E+01 9.08E+01 1.04E+02 1.01E+02 9.84E+01 9.46E+01 7.63E+01 1.12E+02 8.31E+01 9.80E+01 60 8.07E+01 9.13E+01 9.10E+01 1.04E+02 1.01E+02 9.88E+01 9.45E+01 7.63E+01 1.11E+02 8.30E+01 9.81E+01 70 8.13E+01 9.09E+01 9.34E+01 1.08E+02 9.76E+01 1.05E+02 9.31E+01 7.63E+01 1.29E+02 8.46E+01 9.78E+01 9.21E+01 7.92E+00 1.14E+02 7.03E+01 9.31E+01 8.66E+00 1.17E+02 6.93E+01 9.25E+01 8.02E+00 1.14E+02 7.05E+01 9.31E+01 8.66E+00 1.17E+02 6.93E+01 9.36E+01 9.22E+00 1.19E+02 6.83E+01 9.35E+01 9.13E+00 1.19E+02 6.85E+01 9.42E+01 9.67E+00 1.21E+02 6.77E+01 9.37E+01 1.53E+01 1.36E+02 5.16E+01 7.00E+01 FAIL 9.25E+01 1.32E+01 1.29E+02 5.63E+01 7.00E+01 FAIL 9.27E+01 1.34E+01 1.30E+02 5.60E+01 7.00E+01 FAIL 9.25E+01 1.32E+01 1.29E+02 5.63E+01 7.00E+01 FAIL 9.29E+01 1.39E+01 1.31E+02 5.47E+01 7.00E+01 FAIL 9.27E+01 1.36E+01 1.30E+02 5.54E+01 7.00E+01 FAIL 9.75E+01 2.04E+01 1.53E+02 4.17E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 306 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.150. Plot of Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 307 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.150. Raw data for Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.46E+01 8.69E+01 8.37E+01 8.88E+01 8.38E+01 8.41E+01 8.98E+01 7.72E+01 9.86E+01 8.74E+01 8.05E+01 10 8.41E+01 8.77E+01 8.42E+01 9.02E+01 8.40E+01 8.41E+01 8.93E+01 7.73E+01 9.94E+01 8.78E+01 8.05E+01 20 8.42E+01 8.76E+01 8.40E+01 8.99E+01 8.40E+01 8.41E+01 8.93E+01 7.73E+01 1.00E+02 8.78E+01 8.05E+01 30 8.41E+01 8.77E+01 8.42E+01 9.02E+01 8.40E+01 8.41E+01 8.93E+01 7.73E+01 9.94E+01 8.78E+01 8.05E+01 50 8.40E+01 8.84E+01 8.47E+01 9.08E+01 8.42E+01 8.42E+01 8.91E+01 7.74E+01 9.86E+01 8.80E+01 8.04E+01 60 8.41E+01 8.84E+01 8.45E+01 9.08E+01 8.42E+01 8.42E+01 8.90E+01 7.73E+01 9.96E+01 8.81E+01 8.05E+01 70 8.32E+01 8.75E+01 8.47E+01 9.04E+01 8.59E+01 8.40E+01 8.92E+01 7.72E+01 9.90E+01 8.73E+01 8.04E+01 8.55E+01 2.20E+00 9.16E+01 7.95E+01 8.60E+01 2.80E+00 9.37E+01 7.84E+01 8.59E+01 2.68E+00 9.33E+01 7.86E+01 8.60E+01 2.80E+00 9.37E+01 7.84E+01 8.64E+01 3.04E+00 9.47E+01 7.81E+01 8.64E+01 3.05E+00 9.48E+01 7.81E+01 8.63E+01 2.74E+00 9.39E+01 7.88E+01 8.74E+01 7.84E+00 1.09E+02 6.59E+01 7.00E+01 FAIL 8.76E+01 8.07E+00 1.10E+02 6.55E+01 7.00E+01 FAIL 8.77E+01 8.34E+00 1.11E+02 6.49E+01 7.00E+01 FAIL 8.76E+01 8.07E+00 1.10E+02 6.55E+01 7.00E+01 FAIL 8.74E+01 7.76E+00 1.09E+02 6.62E+01 7.00E+01 FAIL 8.77E+01 8.14E+00 1.10E+02 6.53E+01 7.00E+01 FAIL 8.73E+01 7.96E+00 1.09E+02 6.55E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 308 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.151. Plot of Output Voltage Swing High IL= 0mA @ 3V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 309 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.151. Raw data for Output Voltage Swing High IL= 0mA @ 3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.02E-03 3.83E-03 3.72E-03 3.63E-03 3.78E-03 3.83E-03 3.78E-03 3.73E-03 3.68E-03 3.85E-03 3.97E-03 10 3.96E-03 3.71E-03 3.53E-03 3.68E-03 3.78E-03 4.10E-03 3.88E-03 3.91E-03 3.78E-03 3.88E-03 3.95E-03 20 3.94E-03 3.72E-03 3.69E-03 3.60E-03 3.75E-03 3.81E-03 3.84E-03 3.84E-03 3.74E-03 3.65E-03 3.86E-03 30 3.96E-03 3.71E-03 3.53E-03 3.68E-03 3.78E-03 4.10E-03 3.88E-03 3.91E-03 3.78E-03 3.88E-03 3.95E-03 50 4.02E-03 3.65E-03 3.55E-03 3.83E-03 3.77E-03 3.93E-03 3.77E-03 3.90E-03 3.72E-03 4.02E-03 3.99E-03 60 3.99E-03 3.69E-03 3.62E-03 3.80E-03 3.84E-03 3.94E-03 3.97E-03 4.01E-03 3.87E-03 3.89E-03 3.89E-03 70 3.76E-03 3.73E-03 3.54E-03 3.68E-03 3.47E-03 3.90E-03 3.85E-03 3.81E-03 3.51E-03 3.81E-03 3.76E-03 3.80E-03 1.46E-04 4.20E-03 3.40E-03 3.73E-03 1.57E-04 4.16E-03 3.30E-03 3.74E-03 1.25E-04 4.08E-03 3.40E-03 3.73E-03 1.57E-04 4.16E-03 3.30E-03 3.76E-03 1.79E-04 4.26E-03 3.27E-03 3.79E-03 1.43E-04 4.18E-03 3.40E-03 3.64E-03 1.25E-04 3.98E-03 3.29E-03 3.77E-03 7.02E-05 3.97E-03 3.58E-03 1.00E-02 PASS 3.91E-03 1.17E-04 4.23E-03 3.59E-03 2.00E-02 PASS 3.78E-03 8.14E-05 4.00E-03 3.55E-03 2.00E-02 PASS 3.91E-03 1.17E-04 4.23E-03 3.59E-03 2.00E-02 PASS 3.87E-03 1.22E-04 4.20E-03 3.53E-03 2.00E-02 PASS 3.94E-03 5.73E-05 4.09E-03 3.78E-03 2.00E-02 PASS 3.78E-03 1.53E-04 4.20E-03 3.36E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 310 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.152. Plot of Output Voltage Swing High IL= 0mA @ 3V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 311 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.152. Raw data for Output Voltage Swing High IL= 0mA @ 3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.73E-03 3.73E-03 3.63E-03 3.80E-03 3.70E-03 3.65E-03 3.92E-03 3.77E-03 3.63E-03 3.92E-03 3.68E-03 10 3.69E-03 3.74E-03 3.61E-03 3.66E-03 3.64E-03 3.76E-03 3.91E-03 3.91E-03 3.76E-03 3.95E-03 3.73E-03 20 3.72E-03 3.75E-03 3.67E-03 3.77E-03 3.75E-03 3.72E-03 3.87E-03 3.70E-03 3.81E-03 3.81E-03 3.75E-03 30 3.69E-03 3.74E-03 3.61E-03 3.66E-03 3.64E-03 3.76E-03 3.91E-03 3.91E-03 3.76E-03 3.95E-03 3.73E-03 50 3.92E-03 3.87E-03 3.58E-03 4.47E-03 3.67E-03 3.82E-03 3.87E-03 3.88E-03 3.85E-03 3.90E-03 3.68E-03 60 4.02E-03 3.84E-03 3.70E-03 4.49E-03 3.79E-03 4.01E-03 3.91E-03 4.04E-03 3.79E-03 3.92E-03 3.80E-03 70 3.54E-03 3.69E-03 3.47E-03 3.74E-03 3.66E-03 3.69E-03 3.74E-03 3.76E-03 3.59E-03 3.78E-03 3.68E-03 3.72E-03 6.14E-05 3.89E-03 3.55E-03 3.67E-03 4.97E-05 3.80E-03 3.53E-03 3.73E-03 3.90E-05 3.84E-03 3.63E-03 3.67E-03 4.97E-05 3.80E-03 3.53E-03 3.90E-03 3.47E-04 4.85E-03 2.95E-03 3.97E-03 3.14E-04 4.83E-03 3.11E-03 3.62E-03 1.12E-04 3.93E-03 3.31E-03 3.78E-03 1.40E-04 4.16E-03 3.39E-03 1.00E-02 PASS 3.86E-03 9.09E-05 4.11E-03 3.61E-03 2.00E-02 PASS 3.78E-03 7.05E-05 3.98E-03 3.59E-03 2.00E-02 PASS 3.86E-03 9.09E-05 4.11E-03 3.61E-03 2.00E-02 PASS 3.86E-03 3.05E-05 3.95E-03 3.78E-03 2.00E-02 PASS 3.93E-03 9.81E-05 4.20E-03 3.66E-03 2.00E-02 PASS 3.71E-03 7.60E-05 3.92E-03 3.50E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 312 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.153. Plot of Output Voltage Swing High IL= 0mA @ 3V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 313 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.153. Raw data for Output Voltage Swing High IL= 0mA @ 3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.77E-03 3.78E-03 3.53E-03 3.72E-03 3.66E-03 3.61E-03 3.82E-03 3.80E-03 3.55E-03 3.85E-03 3.70E-03 10 3.88E-03 3.69E-03 3.53E-03 3.71E-03 3.64E-03 3.81E-03 3.83E-03 3.91E-03 3.85E-03 4.03E-03 3.71E-03 20 3.60E-03 3.81E-03 3.86E-03 3.65E-03 3.72E-03 3.82E-03 3.91E-03 3.64E-03 3.59E-03 3.99E-03 3.62E-03 30 3.88E-03 3.69E-03 3.53E-03 3.71E-03 3.64E-03 3.81E-03 3.83E-03 3.91E-03 3.85E-03 4.03E-03 3.71E-03 50 4.04E-03 3.75E-03 3.61E-03 4.56E-03 4.04E-03 3.82E-03 3.92E-03 3.90E-03 3.85E-03 4.00E-03 3.75E-03 60 4.04E-03 3.85E-03 3.65E-03 4.34E-03 4.04E-03 3.89E-03 4.11E-03 3.84E-03 3.99E-03 4.01E-03 3.77E-03 70 3.56E-03 3.78E-03 3.61E-03 3.56E-03 3.56E-03 3.71E-03 3.85E-03 3.79E-03 3.66E-03 3.78E-03 3.64E-03 3.69E-03 1.02E-04 3.97E-03 3.41E-03 3.69E-03 1.27E-04 4.04E-03 3.34E-03 3.73E-03 1.08E-04 4.02E-03 3.43E-03 3.69E-03 1.27E-04 4.04E-03 3.34E-03 4.00E-03 3.64E-04 5.00E-03 3.00E-03 3.98E-03 2.56E-04 4.69E-03 3.28E-03 3.61E-03 9.53E-05 3.88E-03 3.35E-03 3.73E-03 1.36E-04 4.10E-03 3.35E-03 1.00E-02 PASS 3.89E-03 8.88E-05 4.13E-03 3.64E-03 2.00E-02 PASS 3.79E-03 1.72E-04 4.26E-03 3.32E-03 2.00E-02 PASS 3.89E-03 8.88E-05 4.13E-03 3.64E-03 2.00E-02 PASS 3.90E-03 6.94E-05 4.09E-03 3.71E-03 2.00E-02 PASS 3.97E-03 1.06E-04 4.26E-03 3.68E-03 2.00E-02 PASS 3.76E-03 7.40E-05 3.96E-03 3.56E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 314 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.154. Plot of Output Voltage Swing High IL= 0mA @ 3V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 315 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.154. Raw data for Output Voltage Swing High IL= 0mA @ 3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.78E-03 3.82E-03 3.70E-03 3.73E-03 3.80E-03 3.82E-03 3.83E-03 3.83E-03 3.65E-03 3.73E-03 3.90E-03 10 3.91E-03 3.69E-03 3.68E-03 3.73E-03 3.74E-03 3.86E-03 3.88E-03 3.98E-03 3.85E-03 3.93E-03 3.90E-03 20 3.77E-03 3.77E-03 3.70E-03 3.72E-03 3.89E-03 3.87E-03 3.87E-03 3.92E-03 3.54E-03 3.86E-03 3.82E-03 30 3.91E-03 3.69E-03 3.68E-03 3.73E-03 3.74E-03 3.86E-03 3.88E-03 3.98E-03 3.85E-03 3.93E-03 3.90E-03 50 3.90E-03 3.78E-03 3.65E-03 3.63E-03 3.80E-03 3.99E-03 3.97E-03 3.95E-03 3.87E-03 3.88E-03 3.72E-03 60 3.87E-03 3.77E-03 3.74E-03 3.84E-03 3.85E-03 4.06E-03 4.07E-03 3.99E-03 3.85E-03 3.92E-03 3.79E-03 70 3.71E-03 3.63E-03 3.47E-03 3.68E-03 3.64E-03 3.78E-03 3.81E-03 3.90E-03 3.69E-03 3.88E-03 3.88E-03 3.77E-03 4.98E-05 3.90E-03 3.63E-03 3.75E-03 9.30E-05 4.01E-03 3.49E-03 3.77E-03 7.38E-05 3.97E-03 3.57E-03 3.75E-03 9.30E-05 4.01E-03 3.49E-03 3.75E-03 1.12E-04 4.06E-03 3.44E-03 3.81E-03 5.59E-05 3.97E-03 3.66E-03 3.63E-03 9.29E-05 3.88E-03 3.37E-03 3.77E-03 8.01E-05 3.99E-03 3.55E-03 1.00E-02 PASS 3.90E-03 5.43E-05 4.05E-03 3.75E-03 2.00E-02 PASS 3.81E-03 1.54E-04 4.23E-03 3.39E-03 2.00E-02 PASS 3.90E-03 5.43E-05 4.05E-03 3.75E-03 2.00E-02 PASS 3.93E-03 5.40E-05 4.08E-03 3.78E-03 2.00E-02 PASS 3.98E-03 9.36E-05 4.23E-03 3.72E-03 2.00E-02 PASS 3.81E-03 8.41E-05 4.04E-03 3.58E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 316 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.155. Plot of Output Voltage Swing High IL= 1mA @ 3V #1 (V) versus total dose. The data show a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed specification (including after application of the KTL statistics). The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 317 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.155. Raw data for Output Voltage Swing High IL= 1mA @ 3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.99E-02 6.78E-02 6.81E-02 6.72E-02 6.78E-02 6.95E-02 6.75E-02 6.82E-02 6.73E-02 6.89E-02 6.88E-02 10 7.33E-02 7.02E-02 7.03E-02 6.95E-02 7.05E-02 7.07E-02 6.88E-02 6.91E-02 6.83E-02 7.02E-02 6.86E-02 20 7.23E-02 6.96E-02 6.99E-02 6.93E-02 6.96E-02 7.03E-02 6.85E-02 6.87E-02 6.79E-02 6.97E-02 6.88E-02 30 7.33E-02 7.02E-02 7.03E-02 6.95E-02 7.05E-02 7.07E-02 6.88E-02 6.91E-02 6.83E-02 7.02E-02 6.86E-02 50 9.13E-02 8.23E-02 8.67E-02 9.38E-02 9.26E-02 7.13E-02 6.92E-02 6.95E-02 6.89E-02 7.05E-02 6.88E-02 60 9.03E-02 8.19E-02 8.61E-02 9.24E-02 9.13E-02 7.12E-02 6.92E-02 6.98E-02 6.90E-02 7.07E-02 6.88E-02 70 7.19E-02 6.92E-02 6.96E-02 6.88E-02 6.96E-02 7.05E-02 6.86E-02 6.90E-02 6.85E-02 7.01E-02 6.86E-02 6.82E-02 1.02E-03 7.10E-02 6.54E-02 7.08E-02 1.45E-03 7.47E-02 6.68E-02 7.01E-02 1.20E-03 7.34E-02 6.69E-02 7.08E-02 1.45E-03 7.47E-02 6.68E-02 8.93E-02 4.76E-03 1.02E-01 7.63E-02 8.84E-02 4.36E-03 1.00E-01 7.64E-02 6.98E-02 1.21E-03 7.31E-02 6.65E-02 6.83E-02 9.40E-04 7.09E-02 6.57E-02 1.50E-01 PASS 6.94E-02 9.78E-04 7.21E-02 6.67E-02 1.50E-01 PASS 6.90E-02 9.68E-04 7.17E-02 6.64E-02 1.50E-01 PASS 6.94E-02 9.78E-04 7.21E-02 6.67E-02 1.50E-01 PASS 6.99E-02 9.89E-04 7.26E-02 6.72E-02 1.50E-01 PASS 7.00E-02 9.25E-04 7.25E-02 6.74E-02 1.50E-01 PASS 6.94E-02 9.00E-04 7.18E-02 6.69E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 318 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.156. Plot of Output Voltage Swing High IL= 1mA @ 3V #2 (V) versus total dose. The data show a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed specification (including after application of the KTL statistics). The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 319 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.156. Raw data for Output Voltage Swing High IL= 1mA @ 3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.79E-02 6.92E-02 6.51E-02 6.92E-02 6.60E-02 6.76E-02 6.83E-02 6.59E-02 6.69E-02 6.83E-02 6.77E-02 10 7.14E-02 7.17E-02 6.78E-02 7.21E-02 6.87E-02 6.86E-02 6.94E-02 6.66E-02 6.80E-02 6.92E-02 6.77E-02 20 7.07E-02 7.10E-02 6.71E-02 7.14E-02 6.82E-02 6.82E-02 6.92E-02 6.66E-02 6.75E-02 6.88E-02 6.77E-02 30 7.14E-02 7.17E-02 6.78E-02 7.21E-02 6.87E-02 6.86E-02 6.94E-02 6.66E-02 6.80E-02 6.92E-02 6.77E-02 50 1.03E-01 9.12E-02 9.13E-02 1.22E-01 9.49E-02 6.92E-02 6.97E-02 6.72E-02 6.84E-02 6.99E-02 6.77E-02 60 1.01E-01 9.04E-02 8.96E-02 1.17E-01 9.32E-02 6.93E-02 7.01E-02 6.75E-02 6.86E-02 7.01E-02 6.78E-02 70 7.03E-02 7.11E-02 6.69E-02 7.10E-02 6.81E-02 6.87E-02 6.94E-02 6.68E-02 6.80E-02 6.93E-02 6.75E-02 6.75E-02 1.85E-03 7.25E-02 6.24E-02 7.03E-02 1.96E-03 7.57E-02 6.50E-02 6.97E-02 1.91E-03 7.49E-02 6.44E-02 7.03E-02 1.96E-03 7.57E-02 6.50E-02 1.00E-01 1.30E-02 1.36E-01 6.47E-02 9.82E-02 1.15E-02 1.30E-01 6.68E-02 6.95E-02 1.88E-03 7.46E-02 6.43E-02 6.74E-02 1.01E-03 7.02E-02 6.46E-02 1.50E-01 PASS 6.83E-02 1.10E-03 7.14E-02 6.53E-02 1.50E-01 PASS 6.81E-02 1.05E-03 7.09E-02 6.52E-02 1.50E-01 PASS 6.83E-02 1.10E-03 7.14E-02 6.53E-02 1.50E-01 PASS 6.89E-02 1.14E-03 7.20E-02 6.58E-02 1.50E-01 PASS 6.91E-02 1.12E-03 7.22E-02 6.60E-02 1.50E-01 PASS 6.84E-02 1.06E-03 7.13E-02 6.55E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 320 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.157. Plot of Output Voltage Swing High IL= 1mA @ 3V #3 (V) versus total dose. The data show a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed specification (including after application of the KTL statistics). The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 321 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.157. Raw data for Output Voltage Swing High IL= 1mA @ 3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.76E-02 6.92E-02 6.52E-02 6.89E-02 6.67E-02 6.77E-02 6.78E-02 6.57E-02 6.72E-02 6.83E-02 6.77E-02 10 7.15E-02 7.23E-02 6.74E-02 7.19E-02 6.98E-02 6.88E-02 6.89E-02 6.67E-02 6.83E-02 6.95E-02 6.77E-02 20 7.06E-02 7.15E-02 6.69E-02 7.16E-02 6.88E-02 6.84E-02 6.84E-02 6.66E-02 6.80E-02 6.90E-02 6.77E-02 30 7.15E-02 7.23E-02 6.74E-02 7.19E-02 6.98E-02 6.88E-02 6.89E-02 6.67E-02 6.83E-02 6.95E-02 6.77E-02 50 1.03E-01 9.06E-02 8.72E-02 1.21E-01 1.07E-01 6.93E-02 6.92E-02 6.74E-02 6.88E-02 7.03E-02 6.79E-02 60 1.01E-01 8.97E-02 8.59E-02 1.16E-01 1.04E-01 6.93E-02 6.94E-02 6.76E-02 6.89E-02 7.02E-02 6.79E-02 70 7.04E-02 7.11E-02 6.68E-02 7.10E-02 6.85E-02 6.88E-02 6.89E-02 6.69E-02 6.82E-02 6.94E-02 6.77E-02 6.75E-02 1.65E-03 7.21E-02 6.30E-02 7.06E-02 1.99E-03 7.60E-02 6.51E-02 6.99E-02 1.98E-03 7.53E-02 6.44E-02 7.06E-02 1.99E-03 7.60E-02 6.51E-02 1.02E-01 1.35E-02 1.39E-01 6.48E-02 9.94E-02 1.21E-02 1.32E-01 6.63E-02 6.95E-02 1.86E-03 7.47E-02 6.44E-02 6.74E-02 1.01E-03 7.01E-02 6.46E-02 1.50E-01 PASS 6.84E-02 1.06E-03 7.14E-02 6.55E-02 1.50E-01 PASS 6.81E-02 9.19E-04 7.06E-02 6.56E-02 1.50E-01 PASS 6.84E-02 1.06E-03 7.14E-02 6.55E-02 1.50E-01 PASS 6.90E-02 1.06E-03 7.19E-02 6.61E-02 1.50E-01 PASS 6.91E-02 9.69E-04 7.17E-02 6.64E-02 1.50E-01 PASS 6.84E-02 9.40E-04 7.10E-02 6.59E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 322 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.158. Plot of Output Voltage Swing High IL= 1mA @ 3V #4 (V) versus total dose. The data show a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed specification (including after application of the KTL statistics). The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 323 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.158. Raw data for Output Voltage Swing High IL= 1mA @ 3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.94E-02 6.73E-02 6.84E-02 6.74E-02 6.83E-02 6.93E-02 6.77E-02 6.84E-02 6.70E-02 6.90E-02 6.89E-02 10 7.26E-02 7.01E-02 7.09E-02 6.96E-02 7.06E-02 7.04E-02 6.87E-02 6.95E-02 6.80E-02 7.00E-02 6.89E-02 20 7.16E-02 6.92E-02 7.04E-02 6.93E-02 7.00E-02 7.02E-02 6.86E-02 6.89E-02 6.77E-02 6.98E-02 6.88E-02 30 7.26E-02 7.01E-02 7.09E-02 6.96E-02 7.06E-02 7.04E-02 6.87E-02 6.95E-02 6.80E-02 7.00E-02 6.89E-02 50 8.81E-02 8.93E-02 9.23E-02 8.78E-02 9.09E-02 7.12E-02 6.91E-02 7.00E-02 6.87E-02 7.05E-02 6.91E-02 60 8.75E-02 8.85E-02 9.09E-02 8.69E-02 8.98E-02 7.11E-02 6.94E-02 7.01E-02 6.89E-02 7.06E-02 6.90E-02 70 7.15E-02 6.90E-02 7.03E-02 6.87E-02 6.96E-02 7.07E-02 6.86E-02 6.95E-02 6.83E-02 7.00E-02 6.85E-02 6.81E-02 8.33E-04 7.04E-02 6.59E-02 7.08E-02 1.15E-03 7.39E-02 6.76E-02 7.01E-02 1.00E-03 7.28E-02 6.73E-02 7.08E-02 1.15E-03 7.39E-02 6.76E-02 8.97E-02 1.91E-03 9.49E-02 8.45E-02 8.87E-02 1.66E-03 9.33E-02 8.42E-02 6.98E-02 1.13E-03 7.29E-02 6.67E-02 6.83E-02 9.43E-04 7.09E-02 6.57E-02 1.50E-01 PASS 6.93E-02 9.88E-04 7.20E-02 6.66E-02 1.50E-01 PASS 6.90E-02 9.81E-04 7.17E-02 6.63E-02 1.50E-01 PASS 6.93E-02 9.88E-04 7.20E-02 6.66E-02 1.50E-01 PASS 6.99E-02 1.02E-03 7.27E-02 6.71E-02 1.50E-01 PASS 7.00E-02 8.67E-04 7.24E-02 6.77E-02 1.50E-01 PASS 6.94E-02 9.84E-04 7.21E-02 6.67E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 324 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.159. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) versus total dose. The data show a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed specification (including after application of the KTL statistics). The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 325 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.159. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.25E-01 1.23E-01 1.23E-01 1.22E-01 1.23E-01 1.25E-01 1.22E-01 1.24E-01 1.22E-01 1.25E-01 1.24E-01 10 1.29E-01 1.26E-01 1.26E-01 1.24E-01 1.26E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.24E-01 20 1.28E-01 1.25E-01 1.25E-01 1.24E-01 1.25E-01 1.26E-01 1.23E-01 1.25E-01 1.23E-01 1.25E-01 1.24E-01 30 1.29E-01 1.26E-01 1.26E-01 1.24E-01 1.26E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.24E-01 50 1.56E-01 1.44E-01 1.51E-01 1.61E-01 1.59E-01 1.27E-01 1.25E-01 1.25E-01 1.24E-01 1.27E-01 1.24E-01 60 1.55E-01 1.43E-01 1.49E-01 1.59E-01 1.58E-01 1.27E-01 1.25E-01 1.26E-01 1.24E-01 1.27E-01 1.24E-01 70 1.28E-01 1.25E-01 1.26E-01 1.23E-01 1.24E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.24E-01 1.23E-01 1.24E-03 1.26E-01 1.20E-01 1.26E-01 1.82E-03 1.31E-01 1.21E-01 1.25E-01 1.51E-03 1.30E-01 1.21E-01 1.26E-01 1.82E-03 1.31E-01 1.21E-01 1.54E-01 7.16E-03 1.74E-01 1.35E-01 1.53E-01 6.58E-03 1.71E-01 1.35E-01 1.25E-01 1.63E-03 1.30E-01 1.21E-01 1.24E-01 1.50E-03 1.28E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.47E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.24E-01 1.43E-03 1.28E-01 1.21E-01 2.50E-01 PASS 1.25E-01 1.47E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.25E-01 1.38E-03 1.29E-01 1.22E-01 2.50E-01 PASS 1.26E-01 1.50E-03 1.30E-01 1.22E-01 2.50E-01 PASS 1.25E-01 1.38E-03 1.29E-01 1.21E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 326 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 8.00E-01 7.00E-01 6.00E-01 5.00E-01 4.00E-01 3.00E-01 2.00E-01 1.00E-01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.160. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 327 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.160. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.22E-01 1.24E-01 1.20E-01 1.25E-01 1.20E-01 1.23E-01 1.23E-01 1.20E-01 1.21E-01 1.24E-01 1.23E-01 10 1.27E-01 1.28E-01 1.23E-01 1.28E-01 1.24E-01 1.24E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 20 1.25E-01 1.27E-01 1.22E-01 1.27E-01 1.23E-01 1.23E-01 1.24E-01 1.21E-01 1.23E-01 1.24E-01 1.23E-01 30 1.27E-01 1.28E-01 1.23E-01 1.28E-01 1.24E-01 1.24E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 50 1.78E-01 1.57E-01 1.58E-01 5.20E-01 1.64E-01 1.24E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.23E-01 60 1.74E-01 1.55E-01 1.55E-01 2.33E-01 1.61E-01 1.25E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.23E-01 70 1.25E-01 1.27E-01 1.21E-01 1.27E-01 1.22E-01 1.23E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 1.22E-01 2.31E-03 1.29E-01 1.16E-01 1.26E-01 2.46E-03 1.33E-01 1.19E-01 1.25E-01 2.44E-03 1.32E-01 1.18E-01 1.26E-01 2.46E-03 1.33E-01 1.19E-01 2.35E-01 1.59E-01 6.72E-01 -2.01E-01 1.76E-01 3.30E-02 2.66E-01 8.52E-02 1.24E-01 2.44E-03 1.31E-01 1.18E-01 1.22E-01 1.62E-03 1.27E-01 1.18E-01 2.50E-01 PASS 1.23E-01 1.46E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.23E-01 1.50E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.23E-01 1.46E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.24E-01 1.61E-03 1.28E-01 1.20E-01 2.50E-01 FAIL 1.24E-01 1.47E-03 1.28E-01 1.20E-01 2.50E-01 FAIL 1.23E-01 1.30E-03 1.27E-01 1.20E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 328 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 4.50E-01 4.00E-01 3.50E-01 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.161. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 329 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.161. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.22E-01 1.25E-01 1.19E-01 1.24E-01 1.21E-01 1.22E-01 1.23E-01 1.20E-01 1.22E-01 1.24E-01 1.23E-01 10 1.27E-01 1.29E-01 1.22E-01 1.28E-01 1.25E-01 1.24E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 20 1.26E-01 1.27E-01 1.21E-01 1.27E-01 1.23E-01 1.23E-01 1.23E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 30 1.27E-01 1.29E-01 1.22E-01 1.28E-01 1.25E-01 1.24E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 50 1.79E-01 1.56E-01 1.51E-01 3.16E-01 1.94E-01 1.25E-01 1.24E-01 1.22E-01 1.24E-01 1.26E-01 1.23E-01 60 1.74E-01 1.54E-01 1.49E-01 2.26E-01 1.83E-01 1.25E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.23E-01 70 1.25E-01 1.27E-01 1.21E-01 1.26E-01 1.23E-01 1.24E-01 1.24E-01 1.21E-01 1.24E-01 1.25E-01 1.23E-01 1.22E-01 2.55E-03 1.29E-01 1.15E-01 1.26E-01 2.53E-03 1.33E-01 1.19E-01 1.25E-01 2.57E-03 1.32E-01 1.18E-01 1.26E-01 2.53E-03 1.33E-01 1.19E-01 1.99E-01 6.76E-02 3.84E-01 1.35E-02 1.77E-01 3.03E-02 2.60E-01 9.40E-02 1.25E-01 2.48E-03 1.31E-01 1.18E-01 1.22E-01 1.50E-03 1.26E-01 1.18E-01 2.50E-01 PASS 1.23E-01 1.53E-03 1.28E-01 1.19E-01 2.50E-01 PASS 1.23E-01 1.53E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.23E-01 1.53E-03 1.28E-01 1.19E-01 2.50E-01 PASS 1.24E-01 1.61E-03 1.28E-01 1.20E-01 2.50E-01 FAIL 1.25E-01 1.38E-03 1.28E-01 1.21E-01 2.50E-01 FAIL 1.23E-01 1.55E-03 1.28E-01 1.19E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 330 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.162. Plot of Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) versus total dose. The data show a significant change with radiation, however it is not sufficient for any of the units-under-test to exceed specification (including after application of the KTL statistics). The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the preand/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 331 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.162. Raw data for Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.25E-01 1.22E-01 1.24E-01 1.22E-01 1.23E-01 1.25E-01 1.22E-01 1.24E-01 1.22E-01 1.25E-01 1.24E-01 10 1.29E-01 1.26E-01 1.27E-01 1.24E-01 1.26E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.24E-01 20 1.27E-01 1.25E-01 1.27E-01 1.24E-01 1.25E-01 1.26E-01 1.23E-01 1.25E-01 1.22E-01 1.26E-01 1.24E-01 30 1.29E-01 1.26E-01 1.27E-01 1.24E-01 1.26E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.24E-01 50 1.51E-01 1.54E-01 1.59E-01 1.51E-01 1.56E-01 1.27E-01 1.24E-01 1.26E-01 1.24E-01 1.27E-01 1.24E-01 60 1.50E-01 1.53E-01 1.57E-01 1.50E-01 1.54E-01 1.27E-01 1.25E-01 1.27E-01 1.24E-01 1.27E-01 1.24E-01 70 1.27E-01 1.24E-01 1.26E-01 1.24E-01 1.25E-01 1.26E-01 1.24E-01 1.26E-01 1.23E-01 1.26E-01 1.24E-01 1.23E-01 1.30E-03 1.27E-01 1.20E-01 1.26E-01 1.64E-03 1.31E-01 1.22E-01 1.26E-01 1.37E-03 1.29E-01 1.22E-01 1.26E-01 1.64E-03 1.31E-01 1.22E-01 1.54E-01 3.27E-03 1.63E-01 1.45E-01 1.53E-01 3.07E-03 1.61E-01 1.45E-01 1.25E-01 1.37E-03 1.29E-01 1.21E-01 1.23E-01 1.47E-03 1.28E-01 1.19E-01 2.50E-01 PASS 1.25E-01 1.44E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.24E-01 1.59E-03 1.29E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.44E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.26E-01 1.23E-03 1.29E-01 1.22E-01 2.50E-01 PASS 1.26E-01 1.46E-03 1.30E-01 1.22E-01 2.50E-01 PASS 1.25E-01 1.63E-03 1.29E-01 1.20E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 332 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.163. Plot of Output Voltage Swing Low IL= 0mA @ 3V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 333 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.163. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.49E-02 1.47E-02 1.45E-02 1.49E-02 1.45E-02 1.46E-02 1.45E-02 1.44E-02 1.47E-02 1.46E-02 1.47E-02 10 1.44E-02 1.44E-02 1.42E-02 1.45E-02 1.43E-02 1.52E-02 1.49E-02 1.48E-02 1.49E-02 1.50E-02 1.46E-02 20 1.46E-02 1.46E-02 1.44E-02 1.47E-02 1.46E-02 1.51E-02 1.48E-02 1.47E-02 1.47E-02 1.50E-02 1.45E-02 30 1.44E-02 1.44E-02 1.42E-02 1.45E-02 1.43E-02 1.52E-02 1.49E-02 1.48E-02 1.49E-02 1.50E-02 1.46E-02 50 1.01E-02 1.02E-02 1.01E-02 9.79E-03 1.00E-02 1.52E-02 1.54E-02 1.49E-02 1.53E-02 1.51E-02 1.45E-02 60 1.03E-02 1.05E-02 1.00E-02 9.98E-03 9.99E-03 1.53E-02 1.52E-02 1.51E-02 1.53E-02 1.52E-02 1.46E-02 70 1.51E-02 1.51E-02 1.47E-02 1.53E-02 1.52E-02 1.51E-02 1.50E-02 1.48E-02 1.49E-02 1.51E-02 1.46E-02 1.47E-02 1.88E-04 1.52E-02 1.42E-02 1.44E-02 1.15E-04 1.47E-02 1.41E-02 1.46E-02 1.06E-04 1.49E-02 1.43E-02 1.44E-02 1.15E-04 1.47E-02 1.41E-02 1.00E-02 1.62E-04 1.05E-02 9.60E-03 1.01E-02 2.05E-04 1.07E-02 9.58E-03 1.51E-02 1.97E-04 1.56E-02 1.45E-02 1.45E-02 1.09E-04 1.48E-02 1.42E-02 3.00E-02 PASS 1.50E-02 1.61E-04 1.54E-02 1.45E-02 6.00E-02 PASS 1.48E-02 1.63E-04 1.53E-02 1.44E-02 6.00E-02 PASS 1.50E-02 1.61E-04 1.54E-02 1.45E-02 6.00E-02 PASS 1.52E-02 1.74E-04 1.57E-02 1.47E-02 6.00E-02 PASS 1.52E-02 6.73E-05 1.54E-02 1.50E-02 6.00E-02 PASS 1.50E-02 1.28E-04 1.53E-02 1.46E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 334 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.164. Plot of Output Voltage Swing Low IL= 0mA @ 3V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 335 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.164. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.50E-02 1.51E-02 1.50E-02 1.49E-02 1.51E-02 1.47E-02 1.52E-02 1.49E-02 1.47E-02 1.45E-02 1.49E-02 10 1.47E-02 1.41E-02 1.36E-02 1.41E-02 1.47E-02 1.51E-02 1.55E-02 1.53E-02 1.54E-02 1.49E-02 1.46E-02 20 1.48E-02 1.51E-02 1.48E-02 1.47E-02 1.49E-02 1.49E-02 1.55E-02 1.50E-02 1.50E-02 1.47E-02 1.46E-02 30 1.47E-02 1.41E-02 1.36E-02 1.41E-02 1.47E-02 1.51E-02 1.55E-02 1.53E-02 1.54E-02 1.49E-02 1.46E-02 50 9.87E-03 1.03E-02 1.01E-02 9.99E-03 9.94E-03 1.52E-02 1.58E-02 1.54E-02 1.54E-02 1.50E-02 1.48E-02 60 9.93E-03 1.04E-02 1.02E-02 9.84E-03 1.03E-02 1.53E-02 1.58E-02 1.56E-02 1.55E-02 1.50E-02 1.49E-02 70 1.54E-02 1.55E-02 1.53E-02 1.53E-02 1.55E-02 1.50E-02 1.55E-02 1.53E-02 1.52E-02 1.48E-02 1.46E-02 1.50E-02 6.23E-05 1.52E-02 1.48E-02 1.42E-02 4.69E-04 1.55E-02 1.30E-02 1.49E-02 1.29E-04 1.52E-02 1.45E-02 1.42E-02 4.69E-04 1.55E-02 1.30E-02 1.00E-02 1.77E-04 1.05E-02 9.55E-03 1.01E-02 2.19E-04 1.07E-02 9.51E-03 1.54E-02 8.34E-05 1.56E-02 1.52E-02 1.48E-02 2.63E-04 1.55E-02 1.41E-02 3.00E-02 PASS 1.52E-02 2.27E-04 1.59E-02 1.46E-02 6.00E-02 PASS 1.50E-02 2.92E-04 1.58E-02 1.42E-02 6.00E-02 PASS 1.52E-02 2.27E-04 1.59E-02 1.46E-02 6.00E-02 PASS 1.54E-02 2.97E-04 1.62E-02 1.46E-02 6.00E-02 PASS 1.54E-02 2.93E-04 1.63E-02 1.46E-02 6.00E-02 PASS 1.52E-02 2.59E-04 1.59E-02 1.44E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 336 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.165. Plot of Output Voltage Swing Low IL= 0mA @ 3V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 337 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.165. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.46E-02 1.47E-02 1.47E-02 1.47E-02 1.47E-02 1.46E-02 1.47E-02 1.47E-02 1.46E-02 1.44E-02 1.43E-02 10 1.43E-02 1.37E-02 1.40E-02 1.39E-02 1.32E-02 1.48E-02 1.53E-02 1.52E-02 1.52E-02 1.48E-02 1.43E-02 20 1.44E-02 1.46E-02 1.45E-02 1.46E-02 1.45E-02 1.47E-02 1.52E-02 1.49E-02 1.50E-02 1.47E-02 1.41E-02 30 1.43E-02 1.37E-02 1.40E-02 1.39E-02 1.32E-02 1.48E-02 1.53E-02 1.52E-02 1.52E-02 1.48E-02 1.43E-02 50 9.42E-03 1.01E-02 9.98E-03 9.79E-03 9.69E-03 1.50E-02 1.54E-02 1.55E-02 1.54E-02 1.50E-02 1.43E-02 60 9.67E-03 1.03E-02 9.91E-03 9.98E-03 9.79E-03 1.51E-02 1.55E-02 1.56E-02 1.56E-02 1.50E-02 1.43E-02 70 1.50E-02 1.51E-02 1.51E-02 1.51E-02 1.53E-02 1.46E-02 1.52E-02 1.50E-02 1.51E-02 1.48E-02 1.43E-02 1.47E-02 3.03E-05 1.47E-02 1.46E-02 1.38E-02 4.21E-04 1.50E-02 1.27E-02 1.45E-02 5.94E-05 1.47E-02 1.44E-02 1.38E-02 4.21E-04 1.50E-02 1.27E-02 9.80E-03 2.73E-04 1.06E-02 9.05E-03 9.94E-03 2.50E-04 1.06E-02 9.25E-03 1.51E-02 9.45E-05 1.54E-02 1.49E-02 1.46E-02 1.51E-04 1.50E-02 1.42E-02 3.00E-02 PASS 1.51E-02 2.51E-04 1.57E-02 1.44E-02 6.00E-02 PASS 1.49E-02 1.92E-04 1.54E-02 1.44E-02 6.00E-02 PASS 1.51E-02 2.51E-04 1.57E-02 1.44E-02 6.00E-02 PASS 1.53E-02 2.54E-04 1.59E-02 1.46E-02 6.00E-02 PASS 1.53E-02 2.89E-04 1.61E-02 1.46E-02 6.00E-02 PASS 1.49E-02 2.32E-04 1.56E-02 1.43E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 338 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.166. Plot of Output Voltage Swing Low IL= 0mA @ 3V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 339 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.166. Raw data for Output Voltage Swing Low IL= 0mA @ 3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.49E-02 1.48E-02 1.48E-02 1.53E-02 1.50E-02 1.49E-02 1.48E-02 1.47E-02 1.49E-02 1.48E-02 1.50E-02 10 1.48E-02 1.38E-02 1.39E-02 1.51E-02 1.45E-02 1.53E-02 1.51E-02 1.52E-02 1.54E-02 1.54E-02 1.48E-02 20 1.47E-02 1.47E-02 1.46E-02 1.52E-02 1.49E-02 1.52E-02 1.51E-02 1.50E-02 1.51E-02 1.51E-02 1.49E-02 30 1.48E-02 1.38E-02 1.39E-02 1.51E-02 1.45E-02 1.53E-02 1.51E-02 1.52E-02 1.54E-02 1.54E-02 1.48E-02 50 1.06E-02 1.03E-02 1.00E-02 1.01E-02 1.04E-02 1.55E-02 1.53E-02 1.54E-02 1.54E-02 1.54E-02 1.48E-02 60 1.06E-02 1.05E-02 1.03E-02 1.03E-02 1.03E-02 1.55E-02 1.54E-02 1.53E-02 1.57E-02 1.55E-02 1.49E-02 70 1.52E-02 1.50E-02 1.53E-02 1.55E-02 1.53E-02 1.53E-02 1.53E-02 1.50E-02 1.53E-02 1.53E-02 1.48E-02 1.50E-02 1.91E-04 1.55E-02 1.44E-02 1.44E-02 5.69E-04 1.60E-02 1.29E-02 1.48E-02 2.09E-04 1.54E-02 1.43E-02 1.44E-02 5.69E-04 1.60E-02 1.29E-02 1.03E-02 2.14E-04 1.09E-02 9.70E-03 1.04E-02 1.40E-04 1.07E-02 9.98E-03 1.53E-02 1.90E-04 1.58E-02 1.47E-02 1.48E-02 9.34E-05 1.51E-02 1.46E-02 3.00E-02 PASS 1.53E-02 1.15E-04 1.56E-02 1.49E-02 6.00E-02 PASS 1.51E-02 5.94E-05 1.52E-02 1.49E-02 6.00E-02 PASS 1.53E-02 1.15E-04 1.56E-02 1.49E-02 6.00E-02 PASS 1.54E-02 6.44E-05 1.56E-02 1.52E-02 6.00E-02 PASS 1.55E-02 1.29E-04 1.58E-02 1.51E-02 6.00E-02 PASS 1.52E-02 1.15E-04 1.55E-02 1.49E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 340 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.167. Plot of Output Voltage Swing Low IL= 1mA @ 3V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 341 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.167. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.01E-02 4.03E-02 4.02E-02 4.02E-02 4.01E-02 4.01E-02 3.99E-02 3.98E-02 4.03E-02 4.04E-02 3.97E-02 10 4.06E-02 4.06E-02 4.05E-02 4.05E-02 4.02E-02 4.05E-02 4.03E-02 4.03E-02 4.07E-02 4.07E-02 3.98E-02 20 4.04E-02 4.05E-02 4.04E-02 4.06E-02 4.05E-02 4.05E-02 4.01E-02 4.03E-02 4.06E-02 4.06E-02 3.96E-02 30 4.06E-02 4.06E-02 4.05E-02 4.05E-02 4.02E-02 4.05E-02 4.03E-02 4.03E-02 4.07E-02 4.07E-02 3.98E-02 50 3.78E-02 3.79E-02 3.78E-02 3.74E-02 3.75E-02 4.07E-02 4.05E-02 4.05E-02 4.12E-02 4.10E-02 3.98E-02 60 3.80E-02 3.80E-02 3.80E-02 3.76E-02 3.77E-02 4.10E-02 4.08E-02 4.06E-02 4.11E-02 4.11E-02 3.97E-02 70 4.09E-02 4.09E-02 4.09E-02 4.09E-02 4.06E-02 4.06E-02 4.03E-02 4.04E-02 4.08E-02 4.07E-02 3.97E-02 4.02E-02 8.53E-05 4.04E-02 3.99E-02 4.05E-02 1.49E-04 4.09E-02 4.01E-02 4.05E-02 7.23E-05 4.07E-02 4.03E-02 4.05E-02 1.49E-04 4.09E-02 4.01E-02 3.77E-02 2.07E-04 3.82E-02 3.71E-02 3.79E-02 2.05E-04 3.84E-02 3.73E-02 4.08E-02 1.13E-04 4.11E-02 4.05E-02 4.01E-02 2.36E-04 4.07E-02 3.95E-02 1.00E-01 PASS 4.05E-02 1.81E-04 4.10E-02 4.00E-02 1.00E-01 PASS 4.04E-02 1.99E-04 4.09E-02 3.99E-02 1.00E-01 PASS 4.05E-02 1.81E-04 4.10E-02 4.00E-02 1.00E-01 PASS 4.08E-02 2.96E-04 4.16E-02 4.00E-02 1.00E-01 PASS 4.09E-02 2.26E-04 4.16E-02 4.03E-02 1.00E-01 PASS 4.06E-02 1.94E-04 4.11E-02 4.00E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 342 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.168. Plot of Output Voltage Swing Low IL= 1mA @ 3V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 343 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.168. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.08E-02 4.06E-02 4.01E-02 4.09E-02 4.05E-02 4.05E-02 4.06E-02 4.01E-02 4.04E-02 3.99E-02 4.04E-02 10 4.13E-02 4.04E-02 3.94E-02 4.08E-02 4.09E-02 4.07E-02 4.10E-02 4.03E-02 4.07E-02 4.04E-02 4.05E-02 20 4.12E-02 4.09E-02 4.01E-02 4.11E-02 4.08E-02 4.06E-02 4.09E-02 4.02E-02 4.06E-02 4.02E-02 4.04E-02 30 4.13E-02 4.04E-02 3.94E-02 4.08E-02 4.09E-02 4.07E-02 4.10E-02 4.03E-02 4.07E-02 4.04E-02 4.05E-02 50 3.81E-02 3.80E-02 3.74E-02 3.80E-02 3.78E-02 4.10E-02 4.13E-02 4.07E-02 4.12E-02 4.07E-02 4.06E-02 60 3.82E-02 3.82E-02 3.77E-02 3.83E-02 3.80E-02 4.10E-02 4.15E-02 4.07E-02 4.12E-02 4.07E-02 4.06E-02 70 4.16E-02 4.13E-02 4.07E-02 4.16E-02 4.12E-02 4.08E-02 4.10E-02 4.04E-02 4.07E-02 4.06E-02 4.04E-02 4.06E-02 3.09E-04 4.14E-02 3.97E-02 4.05E-02 7.04E-04 4.25E-02 3.86E-02 4.08E-02 4.16E-04 4.20E-02 3.97E-02 4.05E-02 7.04E-04 4.25E-02 3.86E-02 3.79E-02 2.90E-04 3.86E-02 3.71E-02 3.81E-02 2.49E-04 3.88E-02 3.74E-02 4.13E-02 3.96E-04 4.24E-02 4.02E-02 4.03E-02 2.68E-04 4.10E-02 3.96E-02 1.00E-01 PASS 4.06E-02 2.71E-04 4.14E-02 3.99E-02 1.00E-01 PASS 4.05E-02 3.04E-04 4.14E-02 3.97E-02 1.00E-01 PASS 4.06E-02 2.71E-04 4.14E-02 3.99E-02 1.00E-01 PASS 4.10E-02 2.95E-04 4.18E-02 4.02E-02 1.00E-01 PASS 4.10E-02 3.33E-04 4.19E-02 4.01E-02 1.00E-01 PASS 4.07E-02 2.08E-04 4.13E-02 4.01E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 344 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.169. Plot of Output Voltage Swing Low IL= 1mA @ 3V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 345 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.169. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.06E-02 4.00E-02 3.97E-02 4.03E-02 4.01E-02 4.01E-02 4.01E-02 3.98E-02 4.03E-02 3.98E-02 3.98E-02 10 4.08E-02 3.98E-02 3.97E-02 4.05E-02 3.94E-02 4.03E-02 4.07E-02 4.01E-02 4.06E-02 4.02E-02 3.98E-02 20 4.06E-02 4.04E-02 3.99E-02 4.07E-02 4.03E-02 4.02E-02 4.04E-02 4.01E-02 4.05E-02 4.01E-02 3.96E-02 30 4.08E-02 3.98E-02 3.97E-02 4.05E-02 3.94E-02 4.03E-02 4.07E-02 4.01E-02 4.06E-02 4.02E-02 3.98E-02 50 3.76E-02 3.77E-02 3.70E-02 3.76E-02 3.74E-02 4.05E-02 4.09E-02 4.05E-02 4.11E-02 4.04E-02 3.98E-02 60 3.77E-02 3.78E-02 3.73E-02 3.76E-02 3.75E-02 4.06E-02 4.12E-02 4.05E-02 4.11E-02 4.07E-02 3.99E-02 70 4.13E-02 4.07E-02 4.03E-02 4.13E-02 4.09E-02 4.03E-02 4.07E-02 4.02E-02 4.07E-02 4.02E-02 3.98E-02 4.01E-02 3.13E-04 4.10E-02 3.93E-02 4.00E-02 5.65E-04 4.16E-02 3.85E-02 4.04E-02 3.04E-04 4.12E-02 3.95E-02 4.00E-02 5.65E-04 4.16E-02 3.85E-02 3.75E-02 2.62E-04 3.82E-02 3.67E-02 3.76E-02 2.19E-04 3.82E-02 3.70E-02 4.09E-02 4.57E-04 4.22E-02 3.97E-02 4.00E-02 2.13E-04 4.06E-02 3.94E-02 1.00E-01 PASS 4.04E-02 2.21E-04 4.10E-02 3.98E-02 1.00E-01 PASS 4.02E-02 1.85E-04 4.07E-02 3.97E-02 1.00E-01 PASS 4.04E-02 2.21E-04 4.10E-02 3.98E-02 1.00E-01 PASS 4.07E-02 2.67E-04 4.14E-02 4.00E-02 1.00E-01 PASS 4.08E-02 2.96E-04 4.16E-02 4.00E-02 1.00E-01 PASS 4.04E-02 2.54E-04 4.11E-02 3.97E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 346 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.170. Plot of Output Voltage Swing Low IL= 1mA @ 3V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 347 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.170. Raw data for Output Voltage Swing Low IL= 1mA @ 3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.06E-02 4.06E-02 4.07E-02 4.08E-02 4.05E-02 4.05E-02 4.02E-02 4.03E-02 4.07E-02 4.07E-02 4.02E-02 10 4.11E-02 4.02E-02 4.05E-02 4.10E-02 4.06E-02 4.09E-02 4.07E-02 4.05E-02 4.12E-02 4.10E-02 4.01E-02 20 4.08E-02 4.08E-02 4.09E-02 4.11E-02 4.08E-02 4.09E-02 4.03E-02 4.05E-02 4.11E-02 4.08E-02 4.01E-02 30 4.11E-02 4.02E-02 4.05E-02 4.10E-02 4.06E-02 4.09E-02 4.07E-02 4.05E-02 4.12E-02 4.10E-02 4.01E-02 50 3.84E-02 3.80E-02 3.80E-02 3.80E-02 3.77E-02 4.13E-02 4.08E-02 4.09E-02 4.14E-02 4.13E-02 4.01E-02 60 3.84E-02 3.81E-02 3.81E-02 3.80E-02 3.78E-02 4.14E-02 4.09E-02 4.11E-02 4.17E-02 4.14E-02 4.03E-02 70 4.14E-02 4.11E-02 4.14E-02 4.14E-02 4.10E-02 4.09E-02 4.06E-02 4.07E-02 4.11E-02 4.11E-02 4.03E-02 4.06E-02 1.27E-04 4.10E-02 4.03E-02 4.07E-02 3.88E-04 4.17E-02 3.96E-02 4.09E-02 1.34E-04 4.12E-02 4.05E-02 4.07E-02 3.88E-04 4.17E-02 3.96E-02 3.80E-02 2.44E-04 3.87E-02 3.73E-02 3.81E-02 1.86E-04 3.86E-02 3.76E-02 4.13E-02 1.97E-04 4.18E-02 4.07E-02 4.05E-02 2.39E-04 4.11E-02 3.98E-02 1.00E-01 PASS 4.09E-02 2.82E-04 4.16E-02 4.01E-02 1.00E-01 PASS 4.07E-02 3.10E-04 4.16E-02 3.99E-02 1.00E-01 PASS 4.09E-02 2.82E-04 4.16E-02 4.01E-02 1.00E-01 PASS 4.11E-02 2.82E-04 4.19E-02 4.04E-02 1.00E-01 PASS 4.13E-02 3.22E-04 4.22E-02 4.04E-02 1.00E-01 PASS 4.09E-02 2.09E-04 4.15E-02 4.03E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 348 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.171. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 349 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.171. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.80E-02 7.84E-02 7.82E-02 7.72E-02 7.73E-02 7.77E-02 7.71E-02 7.76E-02 7.75E-02 7.84E-02 7.67E-02 10 7.84E-02 7.90E-02 7.86E-02 7.79E-02 7.76E-02 7.80E-02 7.77E-02 7.82E-02 7.81E-02 7.87E-02 7.67E-02 20 7.80E-02 7.85E-02 7.86E-02 7.75E-02 7.78E-02 7.77E-02 7.75E-02 7.79E-02 7.80E-02 7.85E-02 7.63E-02 30 7.84E-02 7.90E-02 7.86E-02 7.79E-02 7.76E-02 7.80E-02 7.77E-02 7.82E-02 7.81E-02 7.87E-02 7.67E-02 50 7.64E-02 7.70E-02 7.65E-02 7.53E-02 7.54E-02 7.85E-02 7.77E-02 7.86E-02 7.86E-02 7.90E-02 7.70E-02 60 7.67E-02 7.73E-02 7.68E-02 7.61E-02 7.62E-02 7.81E-02 7.81E-02 7.87E-02 7.86E-02 7.92E-02 7.69E-02 70 7.83E-02 7.87E-02 7.91E-02 7.83E-02 7.78E-02 7.78E-02 7.78E-02 7.85E-02 7.82E-02 7.87E-02 7.65E-02 7.78E-02 5.22E-04 7.92E-02 7.64E-02 7.83E-02 5.40E-04 7.98E-02 7.68E-02 7.81E-02 4.64E-04 7.93E-02 7.68E-02 7.83E-02 5.40E-04 7.98E-02 7.68E-02 7.61E-02 7.30E-04 7.81E-02 7.41E-02 7.66E-02 4.95E-04 7.80E-02 7.53E-02 7.84E-02 4.80E-04 7.97E-02 7.71E-02 7.76E-02 4.66E-04 7.89E-02 7.64E-02 2.00E-01 PASS 7.81E-02 3.34E-04 7.91E-02 7.72E-02 2.00E-01 PASS 7.79E-02 3.77E-04 7.89E-02 7.69E-02 2.00E-01 PASS 7.81E-02 3.34E-04 7.91E-02 7.72E-02 2.00E-01 PASS 7.85E-02 4.94E-04 7.99E-02 7.71E-02 2.00E-01 PASS 7.85E-02 4.74E-04 7.98E-02 7.72E-02 2.00E-01 PASS 7.82E-02 4.03E-04 7.93E-02 7.71E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 350 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.172. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 351 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.172. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.87E-02 7.83E-02 7.72E-02 7.86E-02 7.77E-02 7.88E-02 7.80E-02 7.73E-02 7.78E-02 7.81E-02 7.83E-02 10 7.92E-02 7.85E-02 7.70E-02 7.87E-02 7.82E-02 7.86E-02 7.85E-02 7.77E-02 7.85E-02 7.79E-02 7.80E-02 20 7.87E-02 7.89E-02 7.77E-02 7.92E-02 7.84E-02 7.85E-02 7.81E-02 7.77E-02 7.83E-02 7.80E-02 7.82E-02 30 7.92E-02 7.85E-02 7.70E-02 7.87E-02 7.82E-02 7.86E-02 7.85E-02 7.77E-02 7.85E-02 7.79E-02 7.80E-02 50 7.69E-02 7.68E-02 7.60E-02 7.67E-02 7.68E-02 7.90E-02 7.88E-02 7.82E-02 7.84E-02 7.82E-02 7.82E-02 60 7.72E-02 7.73E-02 7.61E-02 7.73E-02 7.67E-02 7.91E-02 7.92E-02 7.80E-02 7.90E-02 7.86E-02 7.81E-02 70 7.93E-02 7.93E-02 7.81E-02 7.95E-02 7.87E-02 7.91E-02 7.84E-02 7.73E-02 7.83E-02 7.83E-02 7.80E-02 7.81E-02 6.38E-04 7.98E-02 7.63E-02 7.83E-02 8.28E-04 8.06E-02 7.60E-02 7.86E-02 5.77E-04 8.02E-02 7.70E-02 7.83E-02 8.28E-04 8.06E-02 7.60E-02 7.66E-02 3.57E-04 7.76E-02 7.56E-02 7.69E-02 5.23E-04 7.83E-02 7.55E-02 7.90E-02 5.67E-04 8.06E-02 7.74E-02 7.80E-02 5.18E-04 7.94E-02 7.66E-02 2.00E-01 PASS 7.83E-02 3.99E-04 7.94E-02 7.72E-02 2.00E-01 PASS 7.81E-02 3.07E-04 7.90E-02 7.73E-02 2.00E-01 PASS 7.83E-02 3.99E-04 7.94E-02 7.72E-02 2.00E-01 PASS 7.85E-02 3.47E-04 7.95E-02 7.76E-02 2.00E-01 PASS 7.88E-02 4.83E-04 8.01E-02 7.75E-02 2.00E-01 PASS 7.83E-02 6.25E-04 8.00E-02 7.66E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 352 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.173. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 353 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.173. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.77E-02 7.75E-02 7.66E-02 7.79E-02 7.74E-02 7.79E-02 7.71E-02 7.68E-02 7.74E-02 7.75E-02 7.72E-02 10 7.86E-02 7.77E-02 7.69E-02 7.81E-02 7.70E-02 7.76E-02 7.77E-02 7.73E-02 7.79E-02 7.77E-02 7.72E-02 20 7.83E-02 7.79E-02 7.73E-02 7.82E-02 7.76E-02 7.77E-02 7.79E-02 7.72E-02 7.75E-02 7.74E-02 7.70E-02 30 7.86E-02 7.77E-02 7.69E-02 7.81E-02 7.70E-02 7.76E-02 7.77E-02 7.73E-02 7.79E-02 7.77E-02 7.72E-02 50 7.63E-02 7.63E-02 7.51E-02 7.62E-02 7.56E-02 7.82E-02 7.81E-02 7.77E-02 7.82E-02 7.80E-02 7.72E-02 60 7.65E-02 7.65E-02 7.54E-02 7.62E-02 7.59E-02 7.82E-02 7.81E-02 7.74E-02 7.85E-02 7.81E-02 7.72E-02 70 7.88E-02 7.85E-02 7.76E-02 7.88E-02 7.80E-02 7.80E-02 7.81E-02 7.74E-02 7.78E-02 7.77E-02 7.70E-02 7.74E-02 5.04E-04 7.88E-02 7.60E-02 7.77E-02 7.46E-04 7.97E-02 7.56E-02 7.79E-02 4.18E-04 7.90E-02 7.67E-02 7.77E-02 7.46E-04 7.97E-02 7.56E-02 7.59E-02 5.24E-04 7.73E-02 7.45E-02 7.61E-02 4.45E-04 7.73E-02 7.49E-02 7.83E-02 5.19E-04 7.98E-02 7.69E-02 7.73E-02 4.17E-04 7.84E-02 7.62E-02 2.00E-01 PASS 7.76E-02 2.52E-04 7.83E-02 7.70E-02 2.00E-01 PASS 7.75E-02 2.54E-04 7.82E-02 7.68E-02 2.00E-01 PASS 7.76E-02 2.52E-04 7.83E-02 7.70E-02 2.00E-01 PASS 7.80E-02 2.05E-04 7.86E-02 7.75E-02 2.00E-01 PASS 7.81E-02 3.94E-04 7.91E-02 7.70E-02 2.00E-01 PASS 7.78E-02 2.92E-04 7.86E-02 7.70E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 354 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.174. Plot of Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 355 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.174. Raw data for Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.85E-02 7.84E-02 7.86E-02 7.85E-02 7.78E-02 7.83E-02 7.79E-02 7.84E-02 7.83E-02 7.89E-02 7.77E-02 10 7.91E-02 7.88E-02 7.88E-02 7.86E-02 7.83E-02 7.88E-02 7.83E-02 7.84E-02 7.88E-02 7.92E-02 7.76E-02 20 7.89E-02 7.87E-02 7.92E-02 7.86E-02 7.87E-02 7.85E-02 7.81E-02 7.83E-02 7.89E-02 7.89E-02 7.78E-02 30 7.91E-02 7.88E-02 7.88E-02 7.86E-02 7.83E-02 7.88E-02 7.83E-02 7.84E-02 7.88E-02 7.92E-02 7.76E-02 50 7.69E-02 7.71E-02 7.75E-02 7.67E-02 7.63E-02 7.91E-02 7.83E-02 7.90E-02 7.95E-02 7.98E-02 7.79E-02 60 7.76E-02 7.75E-02 7.77E-02 7.66E-02 7.65E-02 7.95E-02 7.87E-02 7.92E-02 7.97E-02 7.98E-02 7.78E-02 70 7.92E-02 7.94E-02 7.98E-02 7.89E-02 7.89E-02 7.86E-02 7.81E-02 7.86E-02 7.92E-02 7.93E-02 7.74E-02 7.83E-02 3.44E-04 7.93E-02 7.74E-02 7.87E-02 3.10E-04 7.96E-02 7.79E-02 7.88E-02 2.45E-04 7.95E-02 7.82E-02 7.87E-02 3.10E-04 7.96E-02 7.79E-02 7.69E-02 4.27E-04 7.81E-02 7.57E-02 7.72E-02 5.94E-04 7.88E-02 7.55E-02 7.92E-02 3.94E-04 8.03E-02 7.81E-02 7.84E-02 3.41E-04 7.93E-02 7.74E-02 2.00E-01 PASS 7.87E-02 3.64E-04 7.97E-02 7.77E-02 2.00E-01 PASS 7.85E-02 3.51E-04 7.95E-02 7.76E-02 2.00E-01 PASS 7.87E-02 3.64E-04 7.97E-02 7.77E-02 2.00E-01 PASS 7.91E-02 5.41E-04 8.06E-02 7.76E-02 2.00E-01 PASS 7.94E-02 4.41E-04 8.06E-02 7.82E-02 2.00E-01 PASS 7.88E-02 4.75E-04 8.01E-02 7.75E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 356 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 3V #1 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.175. Plot of Positive Short-Circuit Current @ 3V #1 (A) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 357 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.175. Raw data for Positive Short-Circuit Current @ 3V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 3V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.97E-02 -2.06E-02 -2.04E-02 -2.07E-02 -2.05E-02 -1.98E-02 -2.06E-02 -2.04E-02 -2.07E-02 -2.00E-02 -2.01E-02 10 -1.86E-02 -1.96E-02 -1.94E-02 -1.96E-02 -1.93E-02 -1.93E-02 -2.01E-02 -2.00E-02 -2.01E-02 -1.96E-02 -2.01E-02 20 -1.88E-02 -1.98E-02 -1.97E-02 -1.99E-02 -1.97E-02 -1.94E-02 -2.03E-02 -2.01E-02 -2.03E-02 -1.97E-02 -2.01E-02 30 -1.86E-02 -1.96E-02 -1.94E-02 -1.96E-02 -1.93E-02 -1.93E-02 -2.01E-02 -2.00E-02 -2.01E-02 -1.96E-02 -2.01E-02 50 -8.05E-03 -1.12E-02 -9.48E-03 -6.36E-03 -6.91E-03 -1.91E-02 -2.00E-02 -1.98E-02 -1.99E-02 -1.95E-02 -2.01E-02 60 -8.49E-03 -1.17E-02 -1.00E-02 -6.87E-03 -7.38E-03 -1.92E-02 -2.00E-02 -1.98E-02 -2.00E-02 -1.95E-02 -2.01E-02 70 -1.90E-02 -2.00E-02 -1.98E-02 -2.01E-02 -1.98E-02 -1.93E-02 -2.01E-02 -1.99E-02 -2.01E-02 -1.96E-02 -2.01E-02 -2.04E-02 4.07E-04 -1.93E-02 -2.15E-02 -1.93E-02 4.04E-04 -1.82E-02 -2.04E-02 -1.96E-02 4.48E-04 -1.83E-02 -2.08E-02 -1.93E-02 4.04E-04 -1.82E-02 -2.04E-02 -8.41E-03 1.98E-03 -2.97E-03 -1.38E-02 -8.88E-03 1.97E-03 -3.49E-03 -1.43E-02 -1.97E-02 4.36E-04 -1.85E-02 -2.09E-02 -2.03E-02 3.82E-04 -1.93E-02 -2.14E-02 -1.20E-02 PASS -1.98E-02 3.55E-04 -1.89E-02 -2.08E-02 -8.00E-03 PASS -1.99E-02 3.60E-04 -1.90E-02 -2.09E-02 -8.00E-03 PASS -1.98E-02 3.55E-04 -1.89E-02 -2.08E-02 -8.00E-03 PASS -1.97E-02 3.47E-04 -1.87E-02 -2.06E-02 -8.00E-03 FAIL -1.97E-02 3.43E-04 -1.88E-02 -2.06E-02 -8.00E-03 FAIL -1.98E-02 3.60E-04 -1.88E-02 -2.08E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 358 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 3V #2 (A) 5.00E-03 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.176. Plot of Positive Short-Circuit Current @ 3V #2 (A) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 359 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.176. Raw data for Positive Short-Circuit Current @ 3V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 3V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.03E-02 -2.00E-02 -2.15E-02 -1.99E-02 -2.12E-02 -2.05E-02 -2.04E-02 -2.15E-02 -2.09E-02 -2.04E-02 -2.05E-02 10 -1.90E-02 -1.85E-02 -1.97E-02 -1.84E-02 -1.98E-02 -2.01E-02 -1.99E-02 -2.10E-02 -2.04E-02 -2.00E-02 -2.05E-02 20 -1.93E-02 -1.92E-02 -2.07E-02 -1.90E-02 -2.02E-02 -2.02E-02 -2.00E-02 -2.11E-02 -2.05E-02 -2.01E-02 -2.05E-02 30 -1.90E-02 -1.85E-02 -1.97E-02 -1.84E-02 -1.98E-02 -2.01E-02 -1.99E-02 -2.10E-02 -2.04E-02 -2.00E-02 -2.05E-02 50 -4.74E-03 -8.12E-03 -6.85E-03 -2.69E-03 -5.83E-03 -2.00E-02 -1.97E-02 -2.08E-02 -2.02E-02 -1.98E-02 -2.05E-02 60 -5.19E-03 -8.63E-03 -7.47E-03 -3.14E-03 -6.36E-03 -2.00E-02 -1.98E-02 -2.08E-02 -2.02E-02 -1.98E-02 -2.05E-02 70 -1.95E-02 -1.93E-02 -2.08E-02 -1.91E-02 -2.03E-02 -2.01E-02 -1.99E-02 -2.10E-02 -2.04E-02 -1.99E-02 -2.05E-02 -2.06E-02 7.27E-04 -1.86E-02 -2.26E-02 -1.91E-02 6.70E-04 -1.73E-02 -2.09E-02 -1.97E-02 7.48E-04 -1.76E-02 -2.17E-02 -1.91E-02 6.70E-04 -1.73E-02 -2.09E-02 -5.65E-03 2.07E-03 3.38E-05 -1.13E-02 -6.16E-03 2.12E-03 -3.55E-04 -1.20E-02 -1.98E-02 7.34E-04 -1.78E-02 -2.18E-02 -2.07E-02 4.69E-04 -1.95E-02 -2.20E-02 -1.20E-02 PASS -2.03E-02 4.37E-04 -1.91E-02 -2.15E-02 -8.00E-03 PASS -2.04E-02 4.45E-04 -1.91E-02 -2.16E-02 -8.00E-03 PASS -2.03E-02 4.37E-04 -1.91E-02 -2.15E-02 -8.00E-03 PASS -2.01E-02 4.32E-04 -1.89E-02 -2.13E-02 -8.00E-03 FAIL -2.01E-02 4.35E-04 -1.89E-02 -2.13E-02 -8.00E-03 FAIL -2.03E-02 4.38E-04 -1.91E-02 -2.15E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 360 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 3V #3 (A) 5.00E-03 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.177. Plot of Positive Short-Circuit Current @ 3V #3 (A) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 361 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.177. Raw data for Positive Short-Circuit Current @ 3V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 3V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.03E-02 -1.99E-02 -2.16E-02 -1.99E-02 -2.09E-02 -2.05E-02 -2.05E-02 -2.14E-02 -2.08E-02 -2.04E-02 -2.05E-02 10 -1.90E-02 -1.84E-02 -2.03E-02 -1.85E-02 -1.87E-02 -2.01E-02 -2.01E-02 -2.09E-02 -2.02E-02 -1.99E-02 -2.05E-02 20 -1.93E-02 -1.90E-02 -2.08E-02 -1.90E-02 -1.99E-02 -2.02E-02 -2.02E-02 -2.10E-02 -2.03E-02 -2.00E-02 -2.05E-02 30 -1.90E-02 -1.84E-02 -2.03E-02 -1.85E-02 -1.87E-02 -2.01E-02 -2.01E-02 -2.09E-02 -2.02E-02 -1.99E-02 -2.05E-02 50 -4.71E-03 -8.35E-03 -8.09E-03 -2.79E-03 -3.82E-03 -1.99E-02 -1.99E-02 -2.07E-02 -2.00E-02 -1.97E-02 -2.05E-02 60 -5.13E-03 -8.87E-03 -8.73E-03 -3.23E-03 -4.34E-03 -1.99E-02 -1.99E-02 -2.08E-02 -2.01E-02 -1.98E-02 -2.05E-02 70 -1.95E-02 -1.92E-02 -2.09E-02 -1.91E-02 -2.01E-02 -2.01E-02 -2.01E-02 -2.09E-02 -2.02E-02 -1.99E-02 -2.05E-02 -2.05E-02 7.40E-04 -1.85E-02 -2.25E-02 -1.90E-02 7.71E-04 -1.68E-02 -2.11E-02 -1.96E-02 7.73E-04 -1.75E-02 -2.17E-02 -1.90E-02 7.71E-04 -1.68E-02 -2.11E-02 -5.55E-03 2.53E-03 1.39E-03 -1.25E-02 -6.06E-03 2.59E-03 1.05E-03 -1.32E-02 -1.98E-02 7.50E-04 -1.77E-02 -2.18E-02 -2.07E-02 4.27E-04 -1.95E-02 -2.19E-02 -1.20E-02 PASS -2.02E-02 4.02E-04 -1.91E-02 -2.13E-02 -8.00E-03 PASS -2.03E-02 4.08E-04 -1.92E-02 -2.15E-02 -8.00E-03 PASS -2.02E-02 4.02E-04 -1.91E-02 -2.13E-02 -8.00E-03 PASS -2.00E-02 3.91E-04 -1.90E-02 -2.11E-02 -8.00E-03 FAIL -2.01E-02 3.99E-04 -1.90E-02 -2.12E-02 -8.00E-03 FAIL -2.02E-02 3.99E-04 -1.91E-02 -2.13E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 362 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 3V #4 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.178. Plot of Positive Short-Circuit Current @ 3V #4 (A) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 363 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.178. Raw data for Positive Short-Circuit Current @ 3V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 3V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.99E-02 -2.07E-02 -2.02E-02 -2.08E-02 -2.04E-02 -1.99E-02 -2.06E-02 -2.03E-02 -2.08E-02 -2.01E-02 -2.01E-02 10 -1.89E-02 -1.93E-02 -1.89E-02 -1.97E-02 -1.92E-02 -1.94E-02 -2.02E-02 -1.98E-02 -2.03E-02 -1.97E-02 -2.01E-02 20 -1.91E-02 -2.00E-02 -1.94E-02 -2.00E-02 -1.96E-02 -1.95E-02 -2.03E-02 -1.99E-02 -2.04E-02 -1.98E-02 -2.01E-02 30 -1.89E-02 -1.93E-02 -1.89E-02 -1.97E-02 -1.92E-02 -1.94E-02 -2.02E-02 -1.98E-02 -2.03E-02 -1.97E-02 -2.01E-02 50 -9.15E-03 -8.33E-03 -7.65E-03 -8.10E-03 -7.41E-03 -1.92E-02 -2.00E-02 -1.97E-02 -2.01E-02 -1.95E-02 -2.01E-02 60 -9.60E-03 -8.84E-03 -8.20E-03 -8.59E-03 -7.94E-03 -1.93E-02 -2.00E-02 -1.97E-02 -2.01E-02 -1.95E-02 -2.01E-02 70 -1.92E-02 -2.01E-02 -1.96E-02 -2.01E-02 -1.97E-02 -1.94E-02 -2.02E-02 -1.98E-02 -2.03E-02 -1.97E-02 -2.01E-02 -2.04E-02 3.80E-04 -1.93E-02 -2.14E-02 -1.92E-02 3.48E-04 -1.82E-02 -2.02E-02 -1.96E-02 3.85E-04 -1.85E-02 -2.06E-02 -1.92E-02 3.48E-04 -1.82E-02 -2.02E-02 -8.13E-03 6.76E-04 -6.27E-03 -9.98E-03 -8.63E-03 6.42E-04 -6.87E-03 -1.04E-02 -1.97E-02 3.95E-04 -1.86E-02 -2.08E-02 -2.03E-02 3.94E-04 -1.93E-02 -2.14E-02 -1.20E-02 PASS -1.99E-02 3.58E-04 -1.89E-02 -2.09E-02 -8.00E-03 PASS -2.00E-02 3.62E-04 -1.90E-02 -2.10E-02 -8.00E-03 PASS -1.99E-02 3.58E-04 -1.89E-02 -2.09E-02 -8.00E-03 PASS -1.97E-02 3.41E-04 -1.87E-02 -2.06E-02 -8.00E-03 FAIL -1.97E-02 3.52E-04 -1.88E-02 -2.07E-02 -8.00E-03 FAIL -1.99E-02 3.60E-04 -1.89E-02 -2.08E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 364 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 3V #1 (A) 5.00E-02 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.179. Plot of Negative Short-Circuit Current @ 3V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 365 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.179. Raw data for Negative Short-Circuit Current @ 3V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 3V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.43E-02 4.55E-02 4.55E-02 4.63E-02 4.57E-02 4.45E-02 4.57E-02 4.51E-02 4.58E-02 4.49E-02 4.48E-02 10 4.38E-02 4.52E-02 4.53E-02 4.61E-02 4.55E-02 4.45E-02 4.56E-02 4.51E-02 4.57E-02 4.49E-02 4.50E-02 20 4.41E-02 4.53E-02 4.53E-02 4.60E-02 4.55E-02 4.46E-02 4.57E-02 4.52E-02 4.59E-02 4.51E-02 4.51E-02 30 4.38E-02 4.52E-02 4.53E-02 4.61E-02 4.55E-02 4.45E-02 4.56E-02 4.51E-02 4.57E-02 4.49E-02 4.50E-02 50 4.44E-02 4.57E-02 4.57E-02 4.67E-02 4.60E-02 4.43E-02 4.54E-02 4.49E-02 4.55E-02 4.47E-02 4.49E-02 60 4.41E-02 4.54E-02 4.54E-02 4.64E-02 4.57E-02 4.41E-02 4.52E-02 4.47E-02 4.53E-02 4.45E-02 4.48E-02 70 4.40E-02 4.52E-02 4.52E-02 4.60E-02 4.54E-02 4.45E-02 4.56E-02 4.51E-02 4.57E-02 4.49E-02 4.51E-02 4.54E-02 7.19E-04 4.74E-02 4.35E-02 4.52E-02 8.54E-04 4.75E-02 4.28E-02 4.52E-02 7.18E-04 4.72E-02 4.33E-02 4.52E-02 8.54E-04 4.75E-02 4.28E-02 4.57E-02 8.39E-04 4.80E-02 4.34E-02 4.54E-02 8.18E-04 4.76E-02 4.31E-02 4.51E-02 7.28E-04 4.71E-02 4.31E-02 4.52E-02 5.32E-04 4.66E-02 4.37E-02 1.20E-02 PASS 4.51E-02 5.14E-04 4.66E-02 4.37E-02 8.00E-03 PASS 4.53E-02 5.25E-04 4.67E-02 4.38E-02 8.00E-03 PASS 4.51E-02 5.14E-04 4.66E-02 4.37E-02 8.00E-03 PASS 4.50E-02 5.04E-04 4.63E-02 4.36E-02 8.00E-03 PASS 4.47E-02 4.98E-04 4.61E-02 4.34E-02 8.00E-03 PASS 4.51E-02 5.04E-04 4.65E-02 4.38E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 366 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 3V #2 (A) 5.00E-02 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.180. Plot of Negative Short-Circuit Current @ 3V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 367 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.180. Raw data for Negative Short-Circuit Current @ 3V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 3V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.48E-02 4.43E-02 4.65E-02 4.42E-02 4.49E-02 4.55E-02 4.53E-02 4.54E-02 4.53E-02 4.49E-02 4.52E-02 10 4.45E-02 4.42E-02 4.65E-02 4.41E-02 4.48E-02 4.55E-02 4.52E-02 4.54E-02 4.53E-02 4.49E-02 4.54E-02 20 4.46E-02 4.41E-02 4.63E-02 4.39E-02 4.47E-02 4.56E-02 4.53E-02 4.55E-02 4.54E-02 4.51E-02 4.55E-02 30 4.45E-02 4.42E-02 4.65E-02 4.41E-02 4.48E-02 4.55E-02 4.52E-02 4.54E-02 4.53E-02 4.49E-02 4.54E-02 50 4.50E-02 4.45E-02 4.68E-02 4.47E-02 4.53E-02 4.53E-02 4.50E-02 4.52E-02 4.51E-02 4.47E-02 4.53E-02 60 4.47E-02 4.42E-02 4.65E-02 4.43E-02 4.50E-02 4.51E-02 4.48E-02 4.50E-02 4.48E-02 4.45E-02 4.51E-02 70 4.45E-02 4.40E-02 4.62E-02 4.39E-02 4.46E-02 4.55E-02 4.52E-02 4.54E-02 4.53E-02 4.49E-02 4.54E-02 4.50E-02 9.27E-04 4.75E-02 4.24E-02 4.48E-02 9.72E-04 4.75E-02 4.21E-02 4.47E-02 9.47E-04 4.73E-02 4.21E-02 4.48E-02 9.72E-04 4.75E-02 4.21E-02 4.53E-02 9.37E-04 4.78E-02 4.27E-02 4.50E-02 9.27E-04 4.75E-02 4.24E-02 4.46E-02 9.18E-04 4.71E-02 4.21E-02 4.53E-02 2.23E-04 4.59E-02 4.47E-02 1.20E-02 PASS 4.52E-02 2.45E-04 4.59E-02 4.46E-02 8.00E-03 PASS 4.54E-02 2.09E-04 4.60E-02 4.48E-02 8.00E-03 PASS 4.52E-02 2.45E-04 4.59E-02 4.46E-02 8.00E-03 PASS 4.51E-02 2.40E-04 4.57E-02 4.44E-02 8.00E-03 PASS 4.48E-02 2.32E-04 4.55E-02 4.42E-02 8.00E-03 PASS 4.53E-02 2.34E-04 4.59E-02 4.46E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 368 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 3V #3 (A) 5.00E-02 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.181. Plot of Negative Short-Circuit Current @ 3V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 369 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.181. Raw data for Negative Short-Circuit Current @ 3V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 3V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.53E-02 4.47E-02 4.69E-02 4.47E-02 4.54E-02 4.58E-02 4.59E-02 4.59E-02 4.58E-02 4.55E-02 4.57E-02 10 4.49E-02 4.45E-02 4.68E-02 4.46E-02 4.53E-02 4.58E-02 4.58E-02 4.58E-02 4.58E-02 4.54E-02 4.59E-02 20 4.51E-02 4.44E-02 4.66E-02 4.45E-02 4.52E-02 4.59E-02 4.59E-02 4.59E-02 4.59E-02 4.56E-02 4.60E-02 30 4.49E-02 4.45E-02 4.68E-02 4.46E-02 4.53E-02 4.58E-02 4.58E-02 4.58E-02 4.58E-02 4.54E-02 4.59E-02 50 4.55E-02 4.48E-02 4.71E-02 4.52E-02 4.58E-02 4.57E-02 4.56E-02 4.56E-02 4.55E-02 4.52E-02 4.58E-02 60 4.52E-02 4.45E-02 4.68E-02 4.48E-02 4.55E-02 4.54E-02 4.54E-02 4.54E-02 4.53E-02 4.50E-02 4.56E-02 70 4.50E-02 4.44E-02 4.65E-02 4.44E-02 4.51E-02 4.59E-02 4.58E-02 4.58E-02 4.57E-02 4.55E-02 4.59E-02 4.54E-02 8.91E-04 4.78E-02 4.29E-02 4.52E-02 9.15E-04 4.77E-02 4.27E-02 4.52E-02 9.00E-04 4.76E-02 4.27E-02 4.52E-02 9.15E-04 4.77E-02 4.27E-02 4.57E-02 8.96E-04 4.81E-02 4.32E-02 4.54E-02 8.90E-04 4.78E-02 4.29E-02 4.51E-02 8.84E-04 4.75E-02 4.26E-02 4.58E-02 1.74E-04 4.62E-02 4.53E-02 1.20E-02 PASS 4.57E-02 1.78E-04 4.62E-02 4.52E-02 8.00E-03 PASS 4.59E-02 1.45E-04 4.63E-02 4.55E-02 8.00E-03 PASS 4.57E-02 1.78E-04 4.62E-02 4.52E-02 8.00E-03 PASS 4.55E-02 1.72E-04 4.60E-02 4.51E-02 8.00E-03 PASS 4.53E-02 1.65E-04 4.58E-02 4.49E-02 8.00E-03 PASS 4.57E-02 1.58E-04 4.62E-02 4.53E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 370 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 3V #4 (A) 5.00E-02 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 24-hr 60 Anneal 168-hr 70 Anneal Figure 5.182. Plot of Negative Short-Circuit Current @ 3V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 371 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.182. Raw data for Negative Short-Circuit Current @ 3V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 3V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.36E-02 4.49E-02 4.49E-02 4.54E-02 4.49E-02 4.39E-02 4.50E-02 4.44E-02 4.52E-02 4.41E-02 4.41E-02 10 4.32E-02 4.48E-02 4.48E-02 4.51E-02 4.48E-02 4.39E-02 4.50E-02 4.44E-02 4.51E-02 4.40E-02 4.43E-02 20 4.34E-02 4.47E-02 4.47E-02 4.51E-02 4.48E-02 4.39E-02 4.51E-02 4.45E-02 4.53E-02 4.42E-02 4.45E-02 30 4.32E-02 4.48E-02 4.48E-02 4.51E-02 4.48E-02 4.39E-02 4.50E-02 4.44E-02 4.51E-02 4.40E-02 4.43E-02 50 4.37E-02 4.52E-02 4.52E-02 4.58E-02 4.53E-02 4.36E-02 4.48E-02 4.43E-02 4.49E-02 4.39E-02 4.42E-02 60 4.34E-02 4.48E-02 4.49E-02 4.54E-02 4.50E-02 4.35E-02 4.46E-02 4.40E-02 4.47E-02 4.37E-02 4.41E-02 70 4.33E-02 4.46E-02 4.46E-02 4.51E-02 4.47E-02 4.39E-02 4.50E-02 4.44E-02 4.51E-02 4.41E-02 4.44E-02 4.47E-02 6.71E-04 4.66E-02 4.29E-02 4.45E-02 7.71E-04 4.66E-02 4.24E-02 4.45E-02 6.60E-04 4.63E-02 4.27E-02 4.45E-02 7.71E-04 4.66E-02 4.24E-02 4.50E-02 7.85E-04 4.72E-02 4.29E-02 4.47E-02 7.60E-04 4.68E-02 4.26E-02 4.44E-02 6.78E-04 4.63E-02 4.26E-02 4.45E-02 5.87E-04 4.61E-02 4.29E-02 1.20E-02 PASS 4.45E-02 5.61E-04 4.60E-02 4.29E-02 8.00E-03 PASS 4.46E-02 5.74E-04 4.62E-02 4.30E-02 8.00E-03 PASS 4.45E-02 5.61E-04 4.60E-02 4.29E-02 8.00E-03 PASS 4.43E-02 5.50E-04 4.58E-02 4.28E-02 8.00E-03 PASS 4.41E-02 5.50E-04 4.56E-02 4.26E-02 8.00E-03 PASS 4.45E-02 5.46E-04 4.60E-02 4.30E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 372 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Supply Current @ 5V (A) 9.00E-03 8.50E-03 8.00E-03 7.50E-03 7.00E-03 6.50E-03 6.00E-03 5.50E-03 5.00E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.183. Plot of Positive Supply Current @ 5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 373 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.183. Raw data for Positive Supply Current @ 5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @ 5V (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.40E-03 7.55E-03 7.49E-03 7.36E-03 7.48E-03 7.49E-03 7.57E-03 7.68E-03 7.33E-03 7.63E-03 7.62E-03 10 7.31E-03 7.42E-03 7.38E-03 7.25E-03 7.36E-03 7.45E-03 7.48E-03 7.63E-03 7.24E-03 7.57E-03 7.60E-03 20 7.24E-03 7.37E-03 7.33E-03 7.19E-03 7.29E-03 7.43E-03 7.46E-03 7.62E-03 7.22E-03 7.56E-03 7.60E-03 30 7.20E-03 7.33E-03 7.30E-03 7.16E-03 7.26E-03 7.42E-03 7.45E-03 7.60E-03 7.20E-03 7.54E-03 7.61E-03 50 7.09E-03 7.24E-03 7.21E-03 7.06E-03 7.16E-03 7.38E-03 7.41E-03 7.56E-03 7.16E-03 7.50E-03 7.61E-03 60 7.11E-03 7.26E-03 7.22E-03 7.08E-03 7.18E-03 7.40E-03 7.43E-03 7.59E-03 7.18E-03 7.52E-03 7.61E-03 70 7.19E-03 7.34E-03 7.30E-03 7.15E-03 7.26E-03 7.40E-03 7.43E-03 7.58E-03 7.19E-03 7.52E-03 7.61E-03 7.46E-03 7.57E-05 7.66E-03 7.25E-03 7.34E-03 6.58E-05 7.52E-03 7.16E-03 7.28E-03 7.13E-05 7.48E-03 7.09E-03 7.25E-03 7.00E-05 7.44E-03 7.06E-03 7.15E-03 7.66E-05 7.36E-03 6.94E-03 7.17E-03 7.48E-05 7.38E-03 6.96E-03 7.25E-03 7.79E-05 7.46E-03 7.03E-03 7.54E-03 1.37E-04 7.92E-03 7.16E-03 8.80E-03 PASS 7.47E-03 1.49E-04 7.88E-03 7.07E-03 8.80E-03 PASS 7.46E-03 1.53E-04 7.88E-03 7.04E-03 8.80E-03 PASS 7.44E-03 1.53E-04 7.86E-03 7.02E-03 8.80E-03 PASS 7.40E-03 1.53E-04 7.82E-03 6.98E-03 8.80E-03 PASS 7.42E-03 1.56E-04 7.85E-03 7.00E-03 8.80E-03 PASS 7.42E-03 1.49E-04 7.83E-03 7.02E-03 8.80E-03 PASS An ISO 9001:2000 Certified Company 374 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Supply Current @ 5V (A) -5.00E-03 -5.50E-03 -6.00E-03 -6.50E-03 -7.00E-03 -7.50E-03 -8.00E-03 -8.50E-03 -9.00E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.184. Plot of Negative Supply Current @ 5V (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 375 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.184. Raw data for Negative Supply Current @ 5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @ 5V (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 -7.39E-03 -7.54E-03 -7.48E-03 -7.35E-03 -7.47E-03 -7.48E-03 -7.56E-03 -7.68E-03 -7.32E-03 -7.63E-03 -7.61E-03 10 -7.30E-03 -7.42E-03 -7.37E-03 -7.24E-03 -7.35E-03 -7.45E-03 -7.47E-03 -7.63E-03 -7.24E-03 -7.56E-03 -7.59E-03 20 -7.23E-03 -7.36E-03 -7.32E-03 -7.18E-03 -7.28E-03 -7.42E-03 -7.45E-03 -7.61E-03 -7.22E-03 -7.54E-03 -7.59E-03 30 -7.19E-03 -7.32E-03 -7.29E-03 -7.15E-03 -7.25E-03 -7.41E-03 -7.44E-03 -7.60E-03 -7.20E-03 -7.53E-03 -7.60E-03 50 -7.08E-03 -7.23E-03 -7.20E-03 -7.05E-03 -7.15E-03 -7.38E-03 -7.40E-03 -7.56E-03 -7.16E-03 -7.49E-03 -7.61E-03 60 -7.10E-03 -7.25E-03 -7.21E-03 -7.07E-03 -7.17E-03 -7.39E-03 -7.42E-03 -7.58E-03 -7.17E-03 -7.52E-03 -7.60E-03 70 -7.18E-03 -7.34E-03 -7.29E-03 -7.15E-03 -7.25E-03 -7.40E-03 -7.42E-03 -7.57E-03 -7.18E-03 -7.51E-03 -7.60E-03 -7.45E-03 7.57E-05 -7.24E-03 -7.65E-03 -7.34E-03 6.88E-05 -7.15E-03 -7.52E-03 -7.27E-03 7.13E-05 -7.08E-03 -7.47E-03 -7.24E-03 7.00E-05 -7.05E-03 -7.43E-03 -7.14E-03 7.66E-05 -6.93E-03 -7.35E-03 -7.16E-03 7.48E-05 -6.95E-03 -7.37E-03 -7.24E-03 7.79E-05 -7.03E-03 -7.46E-03 -7.53E-03 1.41E-04 -7.15E-03 -7.92E-03 -8.80E-03 PASS -7.47E-03 1.47E-04 -7.07E-03 -7.87E-03 -8.80E-03 PASS -7.45E-03 1.48E-04 -7.04E-03 -7.85E-03 -8.80E-03 PASS -7.44E-03 1.52E-04 -7.02E-03 -7.85E-03 -8.80E-03 PASS -7.40E-03 1.51E-04 -6.98E-03 -7.81E-03 -8.80E-03 PASS -7.42E-03 1.57E-04 -6.98E-03 -7.85E-03 -8.80E-03 PASS -7.42E-03 1.49E-04 -7.01E-03 -7.82E-03 -8.80E-03 PASS An ISO 9001:2000 Certified Company 376 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=0V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.185. Plot of Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 377 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.185. Raw data for Input Offset Voltage @ 5V, VCM=0V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=0V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.28E-04 1.27E-04 -1.43E-04 5.65E-05 -1.11E-04 -1.16E-04 -3.39E-04 6.21E-05 -3.96E-05 -8.45E-05 -3.01E-04 10 -3.28E-04 9.69E-05 -1.68E-04 4.35E-05 -1.36E-04 -1.25E-04 -3.49E-04 4.86E-05 -5.38E-05 -9.66E-05 -3.04E-04 20 -3.12E-04 8.97E-05 -1.64E-04 5.27E-05 -1.31E-04 -1.24E-04 -3.51E-04 4.41E-05 -5.31E-05 -9.48E-05 -3.05E-04 30 -3.05E-04 8.65E-05 -1.66E-04 5.50E-05 -1.21E-04 -1.26E-04 -3.52E-04 4.58E-05 -5.52E-05 -9.30E-05 -3.03E-04 50 -3.04E-04 7.76E-05 -1.70E-04 5.66E-05 -1.21E-04 -1.25E-04 -3.49E-04 4.47E-05 -5.54E-05 -9.18E-05 -3.04E-04 60 -3.04E-04 7.88E-05 -1.71E-04 5.90E-05 -1.18E-04 -1.26E-04 -3.46E-04 4.57E-05 -5.43E-05 -9.06E-05 -3.04E-04 70 -3.10E-04 8.39E-05 -1.72E-04 6.36E-05 -1.12E-04 -1.29E-04 -3.57E-04 4.64E-05 -6.10E-05 -1.02E-04 -3.05E-04 -7.95E-05 1.79E-04 4.11E-04 -5.70E-04 -9.84E-05 1.71E-04 3.71E-04 -5.68E-04 -9.30E-05 1.65E-04 3.60E-04 -5.46E-04 -9.02E-05 1.62E-04 3.54E-04 -5.35E-04 -9.22E-05 1.60E-04 3.47E-04 -5.32E-04 -9.10E-05 1.61E-04 3.51E-04 -5.33E-04 -8.95E-05 1.66E-04 3.65E-04 -5.44E-04 -1.03E-04 1.48E-04 3.02E-04 -5.09E-04 -8.00E-04 PASS 8.00E-04 PASS -1.15E-04 1.46E-04 2.86E-04 -5.16E-04 -9.50E-04 PASS 9.50E-04 PASS -1.16E-04 1.46E-04 2.84E-04 -5.16E-04 -9.50E-04 PASS 9.50E-04 PASS -1.16E-04 1.47E-04 2.86E-04 -5.18E-04 -9.50E-04 PASS 9.50E-04 PASS -1.15E-04 1.45E-04 2.83E-04 -5.14E-04 -9.50E-04 PASS 9.50E-04 PASS -1.14E-04 1.45E-04 2.82E-04 -5.11E-04 -9.50E-04 PASS 9.50E-04 PASS -1.21E-04 1.48E-04 2.86E-04 -5.27E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 378 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=0V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.186. Plot of Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 379 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.186. Raw data for Input Offset Voltage @ 5V, VCM=0V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=0V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 2.41E-04 3.27E-05 1.04E-04 5.11E-06 1.73E-04 4.88E-05 4.27E-06 -1.19E-04 -1.87E-04 -6.64E-05 -1.88E-04 10 2.23E-04 1.27E-05 8.91E-05 -9.51E-06 1.39E-04 3.52E-05 -2.87E-06 -1.28E-04 -1.88E-04 -8.50E-05 -1.91E-04 20 2.38E-04 2.06E-05 9.29E-05 5.59E-06 1.37E-04 3.64E-05 4.00E-08 -1.27E-04 -1.86E-04 -8.33E-05 -1.90E-04 30 2.36E-04 2.21E-05 9.65E-05 1.51E-05 1.43E-04 3.68E-05 -8.10E-07 -1.26E-04 -1.87E-04 -8.41E-05 -1.90E-04 50 2.33E-04 2.28E-05 9.57E-05 1.68E-05 1.34E-04 3.40E-05 -2.50E-06 -1.29E-04 -1.90E-04 -8.86E-05 -1.89E-04 60 2.35E-04 2.41E-05 9.71E-05 1.88E-05 1.41E-04 3.74E-05 -5.70E-07 -1.27E-04 -1.89E-04 -8.38E-05 -1.92E-04 70 2.41E-04 4.07E-05 6.58E-05 -1.90E-06 1.61E-04 3.83E-05 -7.57E-06 -1.23E-04 -1.98E-04 -7.84E-05 -1.89E-04 1.11E-04 9.78E-05 3.80E-04 -1.57E-04 9.08E-05 9.47E-05 3.50E-04 -1.69E-04 9.90E-05 9.47E-05 3.59E-04 -1.61E-04 1.03E-04 9.16E-05 3.54E-04 -1.49E-04 1.00E-04 8.90E-05 3.45E-04 -1.44E-04 1.03E-04 8.96E-05 3.49E-04 -1.43E-04 1.01E-04 9.82E-05 3.70E-04 -1.68E-04 -6.39E-05 9.43E-05 1.95E-04 -3.22E-04 -8.00E-04 PASS 8.00E-04 PASS -7.36E-05 9.07E-05 1.75E-04 -3.22E-04 -9.50E-04 PASS 9.50E-04 PASS -7.19E-05 9.09E-05 1.77E-04 -3.21E-04 -9.50E-04 PASS 9.50E-04 PASS -7.23E-05 9.12E-05 1.78E-04 -3.22E-04 -9.50E-04 PASS 9.50E-04 PASS -7.53E-05 9.15E-05 1.76E-04 -3.26E-04 -9.50E-04 PASS 9.50E-04 PASS -7.27E-05 9.22E-05 1.80E-04 -3.25E-04 -9.50E-04 PASS 9.50E-04 PASS -7.36E-05 9.32E-05 1.82E-04 -3.29E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 380 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=0V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.187. Plot of Input Offset Voltage @ 5V, VCM=0V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 381 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.187. Raw data for Input Offset Voltage @ 5V, VCM=0V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=0V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -5.07E-05 -1.97E-04 -1.92E-04 -5.39E-06 -3.05E-05 -2.16E-05 -2.48E-05 -1.77E-04 -3.04E-04 -6.39E-05 -2.30E-04 10 -7.78E-05 -2.32E-04 -2.05E-04 -4.88E-05 -5.59E-05 -3.44E-05 -3.54E-05 -1.88E-04 -3.15E-04 -7.49E-05 -2.31E-04 20 -7.80E-05 -2.35E-04 -1.94E-04 -4.73E-05 -5.50E-05 -3.78E-05 -3.84E-05 -1.86E-04 -3.13E-04 -7.29E-05 -2.30E-04 30 -8.10E-05 -2.36E-04 -1.87E-04 -4.42E-05 -4.37E-05 -3.89E-05 -3.72E-05 -1.84E-04 -3.12E-04 -7.15E-05 -2.31E-04 50 -9.36E-05 -2.48E-04 -1.78E-04 -5.19E-05 -5.19E-05 -4.03E-05 -3.66E-05 -1.83E-04 -3.11E-04 -6.88E-05 -2.27E-04 60 -9.19E-05 -2.47E-04 -1.75E-04 -5.12E-05 -5.07E-05 -3.85E-05 -3.55E-05 -1.83E-04 -3.09E-04 -6.76E-05 -2.32E-04 70 -1.06E-04 -2.31E-04 -2.05E-04 -4.56E-05 -5.25E-05 -2.00E-05 -4.92E-05 -1.86E-04 -3.17E-04 -7.61E-05 -2.32E-04 -9.52E-05 9.22E-05 1.58E-04 -3.48E-04 -1.24E-04 8.77E-05 1.17E-04 -3.65E-04 -1.22E-04 8.66E-05 1.15E-04 -3.59E-04 -1.18E-04 8.82E-05 1.23E-04 -3.60E-04 -1.25E-04 8.59E-05 1.11E-04 -3.60E-04 -1.23E-04 8.57E-05 1.12E-04 -3.58E-04 -1.28E-04 8.59E-05 1.08E-04 -3.63E-04 -1.18E-04 1.21E-04 2.14E-04 -4.51E-04 -8.00E-04 PASS 8.00E-04 PASS -1.29E-04 1.21E-04 2.02E-04 -4.61E-04 -9.50E-04 PASS 9.50E-04 PASS -1.30E-04 1.19E-04 1.97E-04 -4.56E-04 -9.50E-04 PASS 9.50E-04 PASS -1.29E-04 1.19E-04 1.97E-04 -4.55E-04 -9.50E-04 PASS 9.50E-04 PASS -1.28E-04 1.18E-04 1.97E-04 -4.52E-04 -9.50E-04 PASS 9.50E-04 PASS -1.27E-04 1.18E-04 1.98E-04 -4.51E-04 -9.50E-04 PASS 9.50E-04 PASS -1.30E-04 1.22E-04 2.05E-04 -4.65E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 382 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=0V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.188. Plot of Input Offset Voltage @ 5V, VCM=0V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 383 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.188. Raw data for Input Offset Voltage @ 5V, VCM=0V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=0V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -8.33E-05 1.85E-04 -3.42E-04 8.98E-06 -1.59E-04 -2.53E-05 -1.94E-04 -2.92E-04 1.19E-04 -5.65E-05 -5.50E-05 10 -9.61E-05 1.67E-04 -3.64E-04 -1.16E-05 -1.80E-04 -3.39E-05 -1.98E-04 -3.02E-04 1.01E-04 -6.69E-05 -5.69E-05 20 -8.49E-05 1.67E-04 -3.57E-04 -5.88E-06 -1.73E-04 -3.45E-05 -1.96E-04 -3.02E-04 1.02E-04 -6.71E-05 -5.85E-05 30 -7.97E-05 1.68E-04 -3.55E-04 -2.26E-06 -1.65E-04 -3.50E-05 -1.96E-04 -3.04E-04 1.02E-04 -6.91E-05 -5.60E-05 50 -7.15E-05 1.68E-04 -3.60E-04 4.00E-08 -1.65E-04 -3.70E-05 -1.96E-04 -3.01E-04 1.01E-04 -7.09E-05 -5.63E-05 60 -7.08E-05 1.71E-04 -3.61E-04 6.40E-07 -1.64E-04 -3.57E-05 -1.95E-04 -3.02E-04 1.04E-04 -6.98E-05 -5.72E-05 70 -7.99E-05 1.67E-04 -3.74E-04 4.75E-06 -1.69E-04 -3.43E-05 -2.14E-04 -3.09E-04 8.83E-05 -6.68E-05 -5.79E-05 -7.82E-05 1.96E-04 4.58E-04 -6.15E-04 -9.70E-05 1.97E-04 4.44E-04 -6.38E-04 -9.07E-05 1.94E-04 4.43E-04 -6.24E-04 -8.69E-05 1.94E-04 4.44E-04 -6.18E-04 -8.57E-05 1.96E-04 4.51E-04 -6.22E-04 -8.47E-05 1.97E-04 4.56E-04 -6.25E-04 -9.03E-05 2.01E-04 4.61E-04 -6.42E-04 -8.98E-05 1.58E-04 3.45E-04 -5.24E-04 -8.00E-04 PASS 8.00E-04 PASS -1.00E-04 1.55E-04 3.25E-04 -5.26E-04 -9.50E-04 PASS 9.50E-04 PASS -9.96E-05 1.55E-04 3.25E-04 -5.25E-04 -9.50E-04 PASS 9.50E-04 PASS -1.00E-04 1.56E-04 3.26E-04 -5.27E-04 -9.50E-04 PASS 9.50E-04 PASS -1.01E-04 1.54E-04 3.22E-04 -5.23E-04 -9.50E-04 PASS 9.50E-04 PASS -9.96E-05 1.55E-04 3.26E-04 -5.25E-04 -9.50E-04 PASS 9.50E-04 PASS -1.07E-04 1.56E-04 3.21E-04 -5.35E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 384 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=0V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.189. Plot of Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 385 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.189. Raw data for Input Offset Current @ 5V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=0V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.95E-10 7.42E-09 5.80E-11 4.74E-09 1.57E-10 -3.50E-09 4.45E-10 -6.79E-10 -3.53E-09 -2.56E-09 -7.15E-10 10 1.65E-10 7.00E-09 -6.53E-10 4.30E-09 -1.80E-10 -3.51E-09 3.18E-10 -1.10E-09 -3.09E-09 -2.96E-09 -6.95E-10 20 1.68E-10 6.95E-09 -6.29E-10 4.08E-09 -1.09E-10 -3.42E-09 -6.20E-11 -1.04E-09 -2.82E-09 -2.72E-09 -6.76E-10 30 2.79E-10 6.36E-09 -4.05E-10 3.94E-09 -1.85E-10 -3.41E-09 -6.52E-10 -8.67E-10 -3.24E-09 -3.26E-09 -7.32E-10 50 7.37E-10 6.03E-09 -8.14E-10 3.77E-09 -8.60E-11 -3.73E-09 1.59E-10 -8.83E-10 -3.27E-09 -3.01E-09 -7.09E-10 60 7.61E-10 5.90E-09 -7.69E-10 3.74E-09 -2.95E-10 -3.80E-09 5.30E-11 -6.50E-10 -2.67E-09 -3.38E-09 -7.26E-10 70 1.70E-11 5.94E-09 -1.12E-09 4.29E-09 1.07E-10 -4.10E-09 -5.17E-10 -8.88E-10 -3.03E-09 -3.26E-09 -7.08E-10 2.57E-09 3.34E-09 1.17E-08 -6.59E-09 2.13E-09 3.37E-09 1.14E-08 -7.11E-09 2.09E-09 3.30E-09 1.11E-08 -6.95E-09 2.00E-09 3.01E-09 1.03E-08 -6.26E-09 1.93E-09 2.88E-09 9.82E-09 -5.97E-09 1.87E-09 2.86E-09 9.70E-09 -5.96E-09 1.85E-09 3.08E-09 1.03E-08 -6.59E-09 -1.96E-09 1.78E-09 2.91E-09 -6.84E-09 -6.50E-08 PASS 6.50E-08 PASS -2.07E-09 1.62E-09 2.38E-09 -6.52E-09 -6.50E-08 PASS 6.50E-08 PASS -2.01E-09 1.40E-09 1.84E-09 -5.86E-09 -6.50E-08 PASS 6.50E-08 PASS -2.29E-09 1.40E-09 1.54E-09 -6.11E-09 -6.50E-08 PASS 6.50E-08 PASS -2.15E-09 1.69E-09 2.49E-09 -6.78E-09 -6.50E-08 PASS 6.50E-08 PASS -2.09E-09 1.70E-09 2.58E-09 -6.76E-09 -6.50E-08 PASS 6.50E-08 PASS -2.36E-09 1.57E-09 1.94E-09 -6.66E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 386 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=0V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.190. Plot of Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 387 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.190. Raw data for Input Offset Current @ 5V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=0V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -1.13E-08 1.41E-10 1.16E-09 5.51E-09 1.43E-09 1.14E-09 2.01E-09 3.98E-09 -1.74E-09 9.64E-10 -5.28E-09 10 -1.11E-08 -3.00E-11 8.14E-10 5.58E-09 7.56E-10 1.54E-09 2.01E-09 3.92E-09 -1.39E-09 1.22E-09 -5.18E-09 20 -1.06E-08 1.26E-10 7.21E-10 5.21E-09 9.32E-10 1.62E-09 1.87E-09 3.78E-09 -1.87E-09 1.10E-09 -5.28E-09 30 -1.05E-08 2.42E-10 6.18E-10 5.37E-09 1.45E-09 1.58E-09 1.90E-09 4.17E-09 -1.72E-09 1.27E-09 -5.31E-09 50 -1.10E-08 -3.20E-10 1.95E-10 4.92E-09 1.27E-09 1.16E-09 9.68E-10 4.29E-09 -1.14E-09 1.31E-09 -5.27E-09 60 -1.09E-08 -5.10E-11 1.89E-10 4.96E-09 1.36E-09 1.37E-09 1.14E-09 4.09E-09 -1.24E-09 1.32E-09 -5.25E-09 70 -1.09E-08 1.74E-10 2.98E-10 5.53E-09 1.21E-09 1.27E-09 1.69E-09 3.77E-09 -1.70E-09 1.06E-09 -5.30E-09 -6.17E-10 6.32E-09 1.67E-08 -1.80E-08 -8.02E-10 6.19E-09 1.62E-08 -1.78E-08 -7.20E-10 5.87E-09 1.54E-08 -1.68E-08 -5.65E-10 5.92E-09 1.57E-08 -1.68E-08 -9.87E-10 5.96E-09 1.54E-08 -1.73E-08 -8.83E-10 5.93E-09 1.54E-08 -1.72E-08 -7.46E-10 6.10E-09 1.60E-08 -1.75E-08 1.27E-09 2.07E-09 6.93E-09 -4.40E-09 -6.50E-08 PASS 6.50E-08 PASS 1.46E-09 1.90E-09 6.68E-09 -3.76E-09 -6.50E-08 PASS 6.50E-08 PASS 1.30E-09 2.04E-09 6.90E-09 -4.30E-09 -6.50E-08 PASS 6.50E-08 PASS 1.44E-09 2.10E-09 7.21E-09 -4.33E-09 -6.50E-08 PASS 6.50E-08 PASS 1.32E-09 1.94E-09 6.63E-09 -4.00E-09 -6.50E-08 PASS 6.50E-08 PASS 1.34E-09 1.89E-09 6.52E-09 -3.84E-09 -6.50E-08 PASS 6.50E-08 PASS 1.22E-09 1.96E-09 6.58E-09 -4.15E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 388 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=0V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.191. Plot of Input Offset Current @ 5V, VCM=0V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 389 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.191. Raw data for Input Offset Current @ 5V, VCM=0V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=0V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -4.61E-10 -1.01E-09 4.59E-09 -1.13E-09 -2.95E-09 -4.15E-09 -3.23E-09 2.88E-09 2.53E-10 3.15E-09 2.39E-09 10 -8.65E-10 -1.21E-09 4.74E-09 -2.71E-09 -2.91E-09 -4.28E-09 -3.27E-09 3.00E-09 4.00E-12 2.73E-09 2.34E-09 20 -1.05E-09 -1.11E-09 4.72E-09 -2.21E-09 -2.54E-09 -4.00E-09 -3.32E-09 2.97E-09 3.35E-10 2.95E-09 2.39E-09 30 -9.60E-10 -8.68E-10 4.77E-09 -2.62E-09 -2.41E-09 -3.94E-09 -3.14E-09 3.83E-09 7.64E-10 3.17E-09 2.42E-09 50 -8.20E-10 -1.44E-09 4.62E-09 -2.42E-09 -2.40E-09 -3.11E-09 -3.12E-09 3.78E-09 1.05E-09 2.64E-09 2.42E-09 60 -8.70E-10 -1.18E-09 4.77E-09 -2.49E-09 -2.37E-09 -3.33E-09 -3.19E-09 3.58E-09 9.47E-10 2.88E-09 2.42E-09 70 -4.24E-10 -8.89E-10 5.02E-09 -1.86E-09 -3.16E-09 -3.77E-09 -3.25E-09 3.09E-09 7.69E-10 3.26E-09 2.40E-09 -1.93E-10 2.84E-09 7.58E-09 -7.97E-09 -5.90E-10 3.11E-09 7.93E-09 -9.11E-09 -4.36E-10 2.96E-09 7.68E-09 -8.55E-09 -4.19E-10 3.01E-09 7.83E-09 -8.67E-09 -4.93E-10 2.93E-09 7.55E-09 -8.54E-09 -4.26E-10 2.99E-09 7.77E-09 -8.63E-09 -2.63E-10 3.13E-09 8.32E-09 -8.85E-09 -2.21E-10 3.38E-09 9.04E-09 -9.49E-09 -6.50E-08 PASS 6.50E-08 PASS -3.63E-10 3.35E-09 8.82E-09 -9.54E-09 -6.50E-08 PASS 6.50E-08 PASS -2.12E-10 3.33E-09 8.92E-09 -9.35E-09 -6.50E-08 PASS 6.50E-08 PASS 1.37E-10 3.56E-09 9.89E-09 -9.61E-09 -6.50E-08 PASS 6.50E-08 PASS 2.47E-10 3.22E-09 9.07E-09 -8.57E-09 -6.50E-08 PASS 6.50E-08 PASS 1.78E-10 3.28E-09 9.17E-09 -8.82E-09 -6.50E-08 PASS 6.50E-08 PASS 1.96E-11 3.37E-09 9.27E-09 -9.23E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 390 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=0V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.192. Plot of Input Offset Current @ 5V, VCM=0V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 391 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.192. Raw data for Input Offset Current @ 5V, VCM=0V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=0V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.06E-09 3.76E-09 -4.40E-09 -1.63E-09 -1.45E-09 -1.56E-09 2.47E-09 -1.24E-08 -3.93E-09 -4.48E-09 -2.92E-10 10 -2.37E-09 4.31E-09 -4.33E-09 -1.30E-09 -1.50E-09 -2.03E-09 2.85E-09 -1.31E-08 -3.65E-09 -4.08E-09 -2.99E-10 20 -2.37E-09 4.07E-09 -4.48E-09 -1.33E-09 -1.97E-09 -1.57E-09 2.09E-09 -1.29E-08 -3.62E-09 -4.19E-09 -2.63E-10 30 -2.25E-09 4.36E-09 -4.56E-09 -1.29E-09 -1.70E-09 -1.44E-09 2.47E-09 -1.32E-08 -2.82E-09 -4.55E-09 -2.90E-10 50 -2.22E-09 4.30E-09 -4.16E-09 -5.93E-10 -2.18E-09 -1.64E-09 3.10E-09 -1.18E-08 -3.39E-09 -4.28E-09 -3.84E-10 60 -2.44E-09 4.19E-09 -4.25E-09 -5.99E-10 -2.13E-09 -1.60E-09 3.11E-09 -1.17E-08 -2.86E-09 -3.93E-09 -3.39E-10 70 -2.79E-09 4.53E-09 -3.66E-09 -1.26E-09 -1.84E-09 -2.03E-09 3.12E-09 -1.29E-08 -3.23E-09 -4.32E-09 -2.89E-10 -1.15E-09 2.99E-09 7.05E-09 -9.36E-09 -1.04E-09 3.22E-09 7.79E-09 -9.86E-09 -1.21E-09 3.18E-09 7.51E-09 -9.94E-09 -1.09E-09 3.30E-09 7.95E-09 -1.01E-08 -9.72E-10 3.21E-09 7.82E-09 -9.76E-09 -1.04E-09 3.20E-09 7.74E-09 -9.82E-09 -1.00E-09 3.23E-09 7.84E-09 -9.85E-09 -3.99E-09 5.46E-09 1.10E-08 -1.90E-08 -6.50E-08 PASS 6.50E-08 PASS -3.99E-09 5.77E-09 1.18E-08 -1.98E-08 -6.50E-08 PASS 6.50E-08 PASS -4.04E-09 5.52E-09 1.11E-08 -1.92E-08 -6.50E-08 PASS 6.50E-08 PASS -3.92E-09 5.81E-09 1.20E-08 -1.99E-08 -6.50E-08 PASS 6.50E-08 PASS -3.60E-09 5.39E-09 1.12E-08 -1.84E-08 -6.50E-08 PASS 6.50E-08 PASS -3.39E-09 5.35E-09 1.13E-08 -1.81E-08 -6.50E-08 PASS 6.50E-08 PASS -3.87E-09 5.79E-09 1.20E-08 -1.98E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 392 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=0V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.193. Plot of Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 393 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.193. Raw data for Positive Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=0V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.35E-07 -3.06E-07 -3.02E-07 -3.21E-07 -3.32E-07 -3.33E-07 -3.25E-07 -3.14E-07 -3.07E-07 -3.09E-07 -3.29E-07 10 -3.40E-07 -3.13E-07 -3.08E-07 -3.26E-07 -3.37E-07 -3.47E-07 -3.46E-07 -3.28E-07 -3.22E-07 -3.24E-07 -3.30E-07 20 -3.41E-07 -3.16E-07 -3.11E-07 -3.28E-07 -3.39E-07 -3.53E-07 -3.52E-07 -3.34E-07 -3.27E-07 -3.29E-07 -3.30E-07 30 -3.41E-07 -3.18E-07 -3.12E-07 -3.28E-07 -3.39E-07 -3.59E-07 -3.58E-07 -3.38E-07 -3.32E-07 -3.34E-07 -3.29E-07 50 -3.44E-07 -3.21E-07 -3.15E-07 -3.30E-07 -3.46E-07 -3.66E-07 -3.65E-07 -3.50E-07 -3.39E-07 -3.48E-07 -3.29E-07 60 -3.44E-07 -3.20E-07 -3.14E-07 -3.29E-07 -3.41E-07 -3.65E-07 -3.65E-07 -3.49E-07 -3.38E-07 -3.40E-07 -3.29E-07 70 -3.38E-07 -3.15E-07 -3.09E-07 -3.26E-07 -3.37E-07 -3.50E-07 -3.48E-07 -3.32E-07 -3.25E-07 -3.28E-07 -3.29E-07 -3.19E-07 1.48E-08 -2.79E-07 -3.60E-07 -3.25E-07 1.40E-08 -2.86E-07 -3.63E-07 -3.27E-07 1.36E-08 -2.90E-07 -3.64E-07 -3.28E-07 1.30E-08 -2.92E-07 -3.63E-07 -3.31E-07 1.36E-08 -2.94E-07 -3.69E-07 -3.30E-07 1.30E-08 -2.94E-07 -3.65E-07 -3.25E-07 1.29E-08 -2.90E-07 -3.60E-07 -3.18E-07 1.09E-08 -2.88E-07 -3.48E-07 -6.50E-07 PASS 6.50E-07 PASS -3.34E-07 1.23E-08 -3.00E-07 -3.67E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.25E-08 -3.05E-07 -3.74E-07 -7.50E-07 PASS 7.50E-07 PASS -3.44E-07 1.32E-08 -3.08E-07 -3.80E-07 -7.50E-07 PASS 7.50E-07 PASS -3.54E-07 1.16E-08 -3.22E-07 -3.85E-07 -8.00E-07 PASS 8.00E-07 PASS -3.51E-07 1.32E-08 -3.15E-07 -3.87E-07 -8.00E-07 PASS 8.00E-07 PASS -3.37E-07 1.17E-08 -3.05E-07 -3.69E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 394 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=0V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.194. Plot of Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 395 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.194. Raw data for Positive Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=0V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.30E-07 -3.17E-07 -3.14E-07 -3.14E-07 -3.21E-07 -3.02E-07 -3.27E-07 -3.27E-07 -3.09E-07 -3.12E-07 -3.10E-07 10 -3.34E-07 -3.23E-07 -3.19E-07 -3.19E-07 -3.27E-07 -3.15E-07 -3.47E-07 -3.41E-07 -3.24E-07 -3.27E-07 -3.11E-07 20 -3.35E-07 -3.26E-07 -3.22E-07 -3.20E-07 -3.29E-07 -3.21E-07 -3.50E-07 -3.51E-07 -3.30E-07 -3.33E-07 -3.11E-07 30 -3.34E-07 -3.26E-07 -3.22E-07 -3.20E-07 -3.29E-07 -3.24E-07 -3.53E-07 -3.55E-07 -3.34E-07 -3.37E-07 -3.10E-07 50 -3.36E-07 -3.29E-07 -3.25E-07 -3.23E-07 -3.31E-07 -3.32E-07 -3.59E-07 -3.62E-07 -3.41E-07 -3.48E-07 -3.10E-07 60 -3.35E-07 -3.28E-07 -3.24E-07 -3.21E-07 -3.30E-07 -3.31E-07 -3.59E-07 -3.60E-07 -3.40E-07 -3.51E-07 -3.10E-07 70 -3.32E-07 -3.23E-07 -3.20E-07 -3.18E-07 -3.26E-07 -3.19E-07 -3.46E-07 -3.49E-07 -3.28E-07 -3.32E-07 -3.10E-07 -3.19E-07 6.76E-09 -3.01E-07 -3.38E-07 -3.25E-07 6.36E-09 -3.07E-07 -3.42E-07 -3.26E-07 5.86E-09 -3.10E-07 -3.42E-07 -3.26E-07 5.66E-09 -3.11E-07 -3.42E-07 -3.29E-07 5.12E-09 -3.15E-07 -3.43E-07 -3.28E-07 5.05E-09 -3.14E-07 -3.41E-07 -3.24E-07 5.73E-09 -3.08E-07 -3.40E-07 -3.16E-07 1.12E-08 -2.85E-07 -3.46E-07 -6.50E-07 PASS 6.50E-07 PASS -3.31E-07 1.30E-08 -2.95E-07 -3.67E-07 -7.00E-07 PASS 7.00E-07 PASS -3.37E-07 1.35E-08 -3.00E-07 -3.74E-07 -7.50E-07 PASS 7.50E-07 PASS -3.41E-07 1.32E-08 -3.05E-07 -3.77E-07 -7.50E-07 PASS 7.50E-07 PASS -3.49E-07 1.23E-08 -3.15E-07 -3.82E-07 -8.00E-07 PASS 8.00E-07 PASS -3.48E-07 1.29E-08 -3.13E-07 -3.84E-07 -8.00E-07 PASS 8.00E-07 PASS -3.35E-07 1.24E-08 -3.00E-07 -3.69E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 396 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=0V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.195. Plot of Positive Input Bias Current @ 5V, VCM=0V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 397 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.195. Raw data for Positive Input Bias Current @ 5V, VCM=0V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=0V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.13E-07 -3.18E-07 -3.16E-07 -3.21E-07 -3.20E-07 -3.05E-07 -3.30E-07 -3.30E-07 -3.08E-07 -3.12E-07 -3.08E-07 10 -3.18E-07 -3.24E-07 -3.22E-07 -3.26E-07 -3.26E-07 -3.17E-07 -3.48E-07 -3.48E-07 -3.23E-07 -3.27E-07 -3.09E-07 20 -3.19E-07 -3.27E-07 -3.24E-07 -3.28E-07 -3.28E-07 -3.22E-07 -3.52E-07 -3.54E-07 -3.29E-07 -3.33E-07 -3.09E-07 30 -3.19E-07 -3.28E-07 -3.25E-07 -3.27E-07 -3.27E-07 -3.27E-07 -3.59E-07 -3.57E-07 -3.33E-07 -3.38E-07 -3.09E-07 50 -3.20E-07 -3.31E-07 -3.27E-07 -3.29E-07 -3.29E-07 -3.34E-07 -3.63E-07 -3.65E-07 -3.41E-07 -3.51E-07 -3.08E-07 60 -3.20E-07 -3.30E-07 -3.26E-07 -3.28E-07 -3.28E-07 -3.32E-07 -3.62E-07 -3.63E-07 -3.39E-07 -3.49E-07 -3.08E-07 70 -3.17E-07 -3.25E-07 -3.22E-07 -3.25E-07 -3.25E-07 -3.21E-07 -3.49E-07 -3.51E-07 -3.27E-07 -3.31E-07 -3.08E-07 -3.18E-07 3.02E-09 -3.09E-07 -3.26E-07 -3.23E-07 3.39E-09 -3.14E-07 -3.33E-07 -3.25E-07 3.61E-09 -3.15E-07 -3.35E-07 -3.25E-07 3.66E-09 -3.15E-07 -3.35E-07 -3.27E-07 4.18E-09 -3.16E-07 -3.39E-07 -3.26E-07 4.10E-09 -3.15E-07 -3.38E-07 -3.23E-07 3.42E-09 -3.13E-07 -3.32E-07 -3.17E-07 1.20E-08 -2.84E-07 -3.50E-07 -6.50E-07 PASS 6.50E-07 PASS -3.33E-07 1.44E-08 -2.93E-07 -3.72E-07 -7.00E-07 PASS 7.00E-07 PASS -3.38E-07 1.41E-08 -3.00E-07 -3.77E-07 -7.50E-07 PASS 7.50E-07 PASS -3.43E-07 1.45E-08 -3.03E-07 -3.82E-07 -7.50E-07 PASS 7.50E-07 PASS -3.51E-07 1.38E-08 -3.13E-07 -3.89E-07 -8.00E-07 PASS 8.00E-07 PASS -3.49E-07 1.36E-08 -3.12E-07 -3.86E-07 -8.00E-07 PASS 8.00E-07 PASS -3.36E-07 1.33E-08 -2.99E-07 -3.72E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 398 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=0V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.196. Plot of Positive Input Bias Current @ 5V, VCM=0V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 399 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.196. Raw data for Positive Input Bias Current @ 5V, VCM=0V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=0V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.47E-07 -3.03E-07 -3.05E-07 -3.19E-07 -3.31E-07 -3.29E-07 -3.29E-07 -3.24E-07 -3.04E-07 -3.09E-07 -3.27E-07 10 -3.51E-07 -3.10E-07 -3.11E-07 -3.23E-07 -3.36E-07 -3.45E-07 -3.49E-07 -3.38E-07 -3.18E-07 -3.23E-07 -3.29E-07 20 -3.53E-07 -3.12E-07 -3.13E-07 -3.25E-07 -3.38E-07 -3.52E-07 -3.56E-07 -3.48E-07 -3.24E-07 -3.28E-07 -3.29E-07 30 -3.55E-07 -3.13E-07 -3.14E-07 -3.25E-07 -3.38E-07 -3.55E-07 -3.60E-07 -3.53E-07 -3.28E-07 -3.33E-07 -3.28E-07 50 -3.54E-07 -3.16E-07 -3.16E-07 -3.27E-07 -3.40E-07 -3.61E-07 -3.67E-07 -3.59E-07 -3.36E-07 -3.41E-07 -3.27E-07 60 -3.54E-07 -3.16E-07 -3.16E-07 -3.25E-07 -3.39E-07 -3.59E-07 -3.67E-07 -3.58E-07 -3.34E-07 -3.39E-07 -3.27E-07 70 -3.51E-07 -3.10E-07 -3.11E-07 -3.23E-07 -3.36E-07 -3.46E-07 -3.52E-07 -3.45E-07 -3.21E-07 -3.27E-07 -3.27E-07 -3.21E-07 1.84E-08 -2.70E-07 -3.71E-07 -3.26E-07 1.77E-08 -2.78E-07 -3.75E-07 -3.28E-07 1.75E-08 -2.80E-07 -3.76E-07 -3.29E-07 1.78E-08 -2.80E-07 -3.78E-07 -3.31E-07 1.62E-08 -2.86E-07 -3.75E-07 -3.30E-07 1.63E-08 -2.85E-07 -3.75E-07 -3.26E-07 1.73E-08 -2.79E-07 -3.74E-07 -3.19E-07 1.18E-08 -2.87E-07 -3.52E-07 -6.50E-07 PASS 6.50E-07 PASS -3.35E-07 1.34E-08 -2.98E-07 -3.71E-07 -7.00E-07 PASS 7.00E-07 PASS -3.42E-07 1.45E-08 -3.02E-07 -3.82E-07 -7.50E-07 PASS 7.50E-07 PASS -3.46E-07 1.44E-08 -3.06E-07 -3.85E-07 -7.50E-07 PASS 7.50E-07 PASS -3.53E-07 1.37E-08 -3.15E-07 -3.90E-07 -8.00E-07 PASS 8.00E-07 PASS -3.51E-07 1.41E-08 -3.12E-07 -3.90E-07 -8.00E-07 PASS 8.00E-07 PASS -3.38E-07 1.33E-08 -3.02E-07 -3.75E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 400 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=0V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.197. Plot of Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 401 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.197. Raw data for Negative Input Bias Current @ 5V, VCM=0V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=0V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.36E-07 -3.14E-07 -3.03E-07 -3.25E-07 -3.32E-07 -3.29E-07 -3.26E-07 -3.13E-07 -3.04E-07 -3.07E-07 -3.28E-07 10 -3.40E-07 -3.21E-07 -3.08E-07 -3.31E-07 -3.37E-07 -3.48E-07 -3.48E-07 -3.27E-07 -3.19E-07 -3.21E-07 -3.30E-07 20 -3.45E-07 -3.23E-07 -3.10E-07 -3.32E-07 -3.39E-07 -3.53E-07 -3.54E-07 -3.33E-07 -3.25E-07 -3.27E-07 -3.30E-07 30 -3.46E-07 -3.24E-07 -3.11E-07 -3.32E-07 -3.39E-07 -3.57E-07 -3.60E-07 -3.37E-07 -3.29E-07 -3.31E-07 -3.29E-07 50 -3.46E-07 -3.28E-07 -3.14E-07 -3.34E-07 -3.48E-07 -3.63E-07 -3.69E-07 -3.52E-07 -3.36E-07 -3.39E-07 -3.28E-07 60 -3.46E-07 -3.26E-07 -3.13E-07 -3.33E-07 -3.41E-07 -3.62E-07 -3.65E-07 -3.48E-07 -3.35E-07 -3.37E-07 -3.28E-07 70 -3.39E-07 -3.21E-07 -3.08E-07 -3.30E-07 -3.37E-07 -3.48E-07 -3.51E-07 -3.31E-07 -3.22E-07 -3.25E-07 -3.29E-07 -3.22E-07 1.37E-08 -2.84E-07 -3.59E-07 -3.27E-07 1.32E-08 -2.91E-07 -3.63E-07 -3.30E-07 1.36E-08 -2.93E-07 -3.67E-07 -3.31E-07 1.33E-08 -2.94E-07 -3.67E-07 -3.34E-07 1.38E-08 -2.96E-07 -3.72E-07 -3.32E-07 1.28E-08 -2.97E-07 -3.67E-07 -3.27E-07 1.25E-08 -2.93E-07 -3.61E-07 -3.16E-07 1.13E-08 -2.85E-07 -3.47E-07 -6.50E-07 PASS 6.50E-07 PASS -3.33E-07 1.44E-08 -2.93E-07 -3.72E-07 -7.00E-07 PASS 7.00E-07 PASS -3.38E-07 1.44E-08 -2.99E-07 -3.78E-07 -7.50E-07 PASS 7.50E-07 PASS -3.43E-07 1.46E-08 -3.03E-07 -3.83E-07 -7.50E-07 PASS 7.50E-07 PASS -3.52E-07 1.42E-08 -3.13E-07 -3.91E-07 -8.00E-07 PASS 8.00E-07 PASS -3.49E-07 1.39E-08 -3.11E-07 -3.88E-07 -8.00E-07 PASS 8.00E-07 PASS -3.35E-07 1.30E-08 -3.00E-07 -3.71E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 402 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=0V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.198. Plot of Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 403 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.198. Raw data for Negative Input Bias Current @ 5V, VCM=0V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=0V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.19E-07 -3.18E-07 -3.15E-07 -3.20E-07 -3.23E-07 -3.04E-07 -3.30E-07 -3.31E-07 -3.08E-07 -3.14E-07 -3.05E-07 10 -3.23E-07 -3.24E-07 -3.20E-07 -3.25E-07 -3.28E-07 -3.17E-07 -3.50E-07 -3.51E-07 -3.23E-07 -3.29E-07 -3.06E-07 20 -3.25E-07 -3.26E-07 -3.22E-07 -3.26E-07 -3.30E-07 -3.22E-07 -3.53E-07 -3.56E-07 -3.28E-07 -3.34E-07 -3.06E-07 30 -3.24E-07 -3.27E-07 -3.23E-07 -3.26E-07 -3.30E-07 -3.26E-07 -3.58E-07 -3.62E-07 -3.32E-07 -3.39E-07 -3.05E-07 50 -3.25E-07 -3.29E-07 -3.25E-07 -3.28E-07 -3.32E-07 -3.33E-07 -3.61E-07 -3.68E-07 -3.40E-07 -3.52E-07 -3.05E-07 60 -3.24E-07 -3.28E-07 -3.25E-07 -3.27E-07 -3.31E-07 -3.32E-07 -3.61E-07 -3.65E-07 -3.38E-07 -3.50E-07 -3.05E-07 70 -3.22E-07 -3.24E-07 -3.21E-07 -3.23E-07 -3.27E-07 -3.20E-07 -3.49E-07 -3.53E-07 -3.26E-07 -3.33E-07 -3.05E-07 -3.19E-07 2.78E-09 -3.11E-07 -3.27E-07 -3.24E-07 2.78E-09 -3.16E-07 -3.32E-07 -3.26E-07 2.72E-09 -3.18E-07 -3.33E-07 -3.26E-07 2.74E-09 -3.18E-07 -3.33E-07 -3.28E-07 2.94E-09 -3.20E-07 -3.36E-07 -3.27E-07 2.90E-09 -3.19E-07 -3.35E-07 -3.23E-07 2.58E-09 -3.16E-07 -3.30E-07 -3.17E-07 1.27E-08 -2.83E-07 -3.52E-07 -6.50E-07 PASS 6.50E-07 PASS -3.34E-07 1.57E-08 -2.91E-07 -3.77E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.51E-08 -2.97E-07 -3.80E-07 -7.50E-07 PASS 7.50E-07 PASS -3.43E-07 1.59E-08 -3.00E-07 -3.87E-07 -7.50E-07 PASS 7.50E-07 PASS -3.51E-07 1.44E-08 -3.12E-07 -3.90E-07 -8.00E-07 PASS 8.00E-07 PASS -3.49E-07 1.43E-08 -3.10E-07 -3.89E-07 -8.00E-07 PASS 8.00E-07 PASS -3.36E-07 1.43E-08 -2.97E-07 -3.75E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 404 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=0V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.199. Plot of Negative Input Bias Current @ 5V, VCM=0V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 405 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.199. Raw data for Negative Input Bias Current @ 5V, VCM=0V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=0V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.13E-07 -3.17E-07 -3.21E-07 -3.20E-07 -3.17E-07 -3.01E-07 -3.27E-07 -3.33E-07 -3.09E-07 -3.16E-07 -3.11E-07 10 -3.18E-07 -3.23E-07 -3.27E-07 -3.24E-07 -3.23E-07 -3.13E-07 -3.41E-07 -3.54E-07 -3.24E-07 -3.30E-07 -3.12E-07 20 -3.19E-07 -3.26E-07 -3.29E-07 -3.25E-07 -3.25E-07 -3.19E-07 -3.50E-07 -3.58E-07 -3.30E-07 -3.36E-07 -3.12E-07 30 -3.18E-07 -3.27E-07 -3.30E-07 -3.26E-07 -3.25E-07 -3.23E-07 -3.54E-07 -3.62E-07 -3.34E-07 -3.47E-07 -3.11E-07 50 -3.20E-07 -3.30E-07 -3.32E-07 -3.27E-07 -3.27E-07 -3.31E-07 -3.61E-07 -3.69E-07 -3.47E-07 -3.54E-07 -3.11E-07 60 -3.19E-07 -3.29E-07 -3.31E-07 -3.26E-07 -3.26E-07 -3.29E-07 -3.59E-07 -3.69E-07 -3.41E-07 -3.53E-07 -3.11E-07 70 -3.17E-07 -3.24E-07 -3.27E-07 -3.23E-07 -3.22E-07 -3.18E-07 -3.47E-07 -3.55E-07 -3.28E-07 -3.35E-07 -3.11E-07 -3.18E-07 3.00E-09 -3.09E-07 -3.26E-07 -3.23E-07 3.34E-09 -3.14E-07 -3.32E-07 -3.25E-07 3.73E-09 -3.15E-07 -3.35E-07 -3.25E-07 4.15E-09 -3.14E-07 -3.37E-07 -3.27E-07 4.69E-09 -3.14E-07 -3.40E-07 -3.26E-07 4.72E-09 -3.13E-07 -3.39E-07 -3.22E-07 3.96E-09 -3.12E-07 -3.33E-07 -3.17E-07 1.31E-08 -2.81E-07 -3.53E-07 -6.50E-07 PASS 6.50E-07 PASS -3.32E-07 1.57E-08 -2.89E-07 -3.75E-07 -7.00E-07 PASS 7.00E-07 PASS -3.39E-07 1.58E-08 -2.95E-07 -3.82E-07 -7.50E-07 PASS 7.50E-07 PASS -3.44E-07 1.58E-08 -3.01E-07 -3.87E-07 -7.50E-07 PASS 7.50E-07 PASS -3.53E-07 1.47E-08 -3.12E-07 -3.93E-07 -8.00E-07 PASS 8.00E-07 PASS -3.50E-07 1.56E-08 -3.07E-07 -3.93E-07 -8.00E-07 PASS 8.00E-07 PASS -3.36E-07 1.49E-08 -2.95E-07 -3.77E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 406 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=0V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.200. Plot of Negative Input Bias Current @ 5V, VCM=0V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 407 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.200. Raw data for Negative Input Bias Current @ 5V, VCM=0V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=0V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -3.47E-07 -3.07E-07 -3.01E-07 -3.17E-07 -3.30E-07 -3.28E-07 -3.32E-07 -3.12E-07 -3.00E-07 -3.05E-07 -3.27E-07 10 -3.50E-07 -3.14E-07 -3.07E-07 -3.22E-07 -3.35E-07 -3.40E-07 -3.53E-07 -3.25E-07 -3.15E-07 -3.19E-07 -3.29E-07 20 -3.52E-07 -3.17E-07 -3.08E-07 -3.24E-07 -3.36E-07 -3.51E-07 -3.59E-07 -3.31E-07 -3.21E-07 -3.24E-07 -3.28E-07 30 -3.53E-07 -3.18E-07 -3.09E-07 -3.24E-07 -3.36E-07 -3.55E-07 -3.64E-07 -3.35E-07 -3.25E-07 -3.28E-07 -3.28E-07 50 -3.53E-07 -3.21E-07 -3.12E-07 -3.26E-07 -3.38E-07 -3.61E-07 -3.71E-07 -3.48E-07 -3.32E-07 -3.37E-07 -3.27E-07 60 -3.53E-07 -3.20E-07 -3.12E-07 -3.25E-07 -3.37E-07 -3.58E-07 -3.70E-07 -3.48E-07 -3.31E-07 -3.35E-07 -3.27E-07 70 -3.50E-07 -3.15E-07 -3.08E-07 -3.22E-07 -3.34E-07 -3.45E-07 -3.57E-07 -3.30E-07 -3.18E-07 -3.23E-07 -3.27E-07 -3.20E-07 1.87E-08 -2.69E-07 -3.72E-07 -3.26E-07 1.74E-08 -2.78E-07 -3.73E-07 -3.27E-07 1.71E-08 -2.81E-07 -3.74E-07 -3.28E-07 1.71E-08 -2.81E-07 -3.75E-07 -3.30E-07 1.59E-08 -2.87E-07 -3.74E-07 -3.29E-07 1.61E-08 -2.85E-07 -3.73E-07 -3.26E-07 1.67E-08 -2.80E-07 -3.72E-07 -3.15E-07 1.39E-08 -2.77E-07 -3.54E-07 -6.50E-07 PASS 6.50E-07 PASS -3.30E-07 1.58E-08 -2.87E-07 -3.74E-07 -7.00E-07 PASS 7.00E-07 PASS -3.37E-07 1.69E-08 -2.91E-07 -3.83E-07 -7.50E-07 PASS 7.50E-07 PASS -3.42E-07 1.70E-08 -2.95E-07 -3.88E-07 -7.50E-07 PASS 7.50E-07 PASS -3.50E-07 1.64E-08 -3.05E-07 -3.95E-07 -8.00E-07 PASS 8.00E-07 PASS -3.48E-07 1.62E-08 -3.04E-07 -3.93E-07 -8.00E-07 PASS 8.00E-07 PASS -3.35E-07 1.60E-08 -2.91E-07 -3.79E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 408 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.201. Plot of Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 409 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.201. Raw data for Input Offset Voltage @ 5V, VCM=5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.30E-05 1.55E-04 1.22E-04 2.04E-04 -9.36E-05 9.81E-05 -1.23E-04 -3.78E-05 2.63E-04 -1.75E-04 -2.47E-04 10 4.74E-06 1.29E-04 1.01E-04 1.92E-04 -1.07E-04 9.27E-05 -1.32E-04 -4.61E-05 2.53E-04 -1.76E-04 -2.50E-04 20 1.78E-05 1.23E-04 1.05E-04 2.00E-04 -9.94E-05 9.28E-05 -1.34E-04 -4.62E-05 2.57E-04 -1.73E-04 -2.50E-04 30 2.21E-05 1.20E-04 1.08E-04 2.01E-04 -9.51E-05 9.26E-05 -1.34E-04 -4.54E-05 2.57E-04 -1.71E-04 -2.49E-04 50 2.07E-05 1.13E-04 1.06E-04 2.03E-04 -9.36E-05 9.76E-05 -1.32E-04 -4.37E-05 2.59E-04 -1.68E-04 -2.50E-04 60 2.12E-05 1.13E-04 1.04E-04 2.06E-04 -9.21E-05 9.69E-05 -1.30E-04 -4.44E-05 2.60E-04 -1.68E-04 -2.50E-04 70 4.00E-08 1.15E-04 1.01E-04 1.98E-04 -7.59E-05 7.54E-05 -1.36E-04 -4.01E-05 2.52E-04 -1.51E-04 -2.51E-04 8.01E-05 1.20E-04 4.08E-04 -2.48E-04 6.40E-05 1.17E-04 3.85E-04 -2.57E-04 6.93E-05 1.14E-04 3.83E-04 -2.44E-04 7.13E-05 1.13E-04 3.80E-04 -2.38E-04 6.97E-05 1.12E-04 3.76E-04 -2.37E-04 7.04E-05 1.12E-04 3.77E-04 -2.37E-04 6.75E-05 1.07E-04 3.60E-04 -2.25E-04 5.04E-06 1.77E-04 4.91E-04 -4.81E-04 -8.00E-04 PASS 8.00E-04 PASS -1.78E-06 1.76E-04 4.80E-04 -4.83E-04 -9.50E-04 PASS 9.50E-04 PASS -7.10E-07 1.77E-04 4.84E-04 -4.85E-04 -9.50E-04 PASS 9.50E-04 PASS -8.60E-08 1.76E-04 4.82E-04 -4.82E-04 -9.50E-04 PASS 9.50E-04 PASS 2.40E-06 1.76E-04 4.86E-04 -4.81E-04 -9.50E-04 PASS 9.50E-04 PASS 2.78E-06 1.76E-04 4.86E-04 -4.80E-04 -9.50E-04 PASS 9.50E-04 PASS 6.20E-08 1.68E-04 4.60E-04 -4.59E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 410 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.202. Plot of Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 411 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.202. Raw data for Input Offset Voltage @ 5V, VCM=5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.92E-04 2.11E-04 2.72E-04 4.06E-04 4.26E-04 3.70E-04 1.80E-04 -1.16E-04 -6.85E-06 9.04E-05 -1.08E-04 10 1.79E-04 1.94E-04 2.55E-04 3.85E-04 3.96E-04 3.64E-04 1.80E-04 -1.20E-04 -8.42E-06 7.73E-05 -1.12E-04 20 1.94E-04 2.02E-04 2.58E-04 3.95E-04 3.92E-04 3.65E-04 1.85E-04 -1.18E-04 -6.24E-06 7.99E-05 -1.08E-04 30 1.92E-04 2.03E-04 2.62E-04 4.03E-04 3.96E-04 3.66E-04 1.87E-04 -1.17E-04 -9.51E-06 8.14E-05 -1.11E-04 50 1.96E-04 2.11E-04 2.63E-04 4.03E-04 3.90E-04 3.65E-04 1.87E-04 -1.18E-04 -8.66E-06 7.99E-05 -1.12E-04 60 2.00E-04 2.12E-04 2.62E-04 4.04E-04 3.92E-04 3.67E-04 1.90E-04 -1.18E-04 -8.54E-06 8.34E-05 -1.12E-04 70 1.86E-04 2.06E-04 2.42E-04 3.87E-04 3.99E-04 3.60E-04 1.77E-04 -1.24E-04 -1.74E-05 7.35E-05 -1.09E-04 3.01E-04 1.09E-04 6.00E-04 2.84E-06 2.82E-04 1.03E-04 5.65E-04 -1.59E-06 2.88E-04 9.95E-05 5.61E-04 1.52E-05 2.91E-04 1.02E-04 5.72E-04 1.07E-05 2.92E-04 9.82E-05 5.62E-04 2.31E-05 2.94E-04 9.80E-05 5.63E-04 2.52E-05 2.84E-04 1.02E-04 5.63E-04 5.50E-06 1.04E-04 1.85E-04 6.12E-04 -4.05E-04 -8.00E-04 PASS 8.00E-04 PASS 9.85E-05 1.85E-04 6.06E-04 -4.09E-04 -9.50E-04 PASS 9.50E-04 PASS 1.01E-04 1.85E-04 6.08E-04 -4.06E-04 -9.50E-04 PASS 9.50E-04 PASS 1.02E-04 1.85E-04 6.10E-04 -4.06E-04 -9.50E-04 PASS 9.50E-04 PASS 1.01E-04 1.85E-04 6.09E-04 -4.08E-04 -9.50E-04 PASS 9.50E-04 PASS 1.03E-04 1.86E-04 6.14E-04 -4.08E-04 -9.50E-04 PASS 9.50E-04 PASS 9.40E-05 1.86E-04 6.03E-04 -4.15E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 412 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.203. Plot of Input Offset Voltage @ 5V, VCM=5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 413 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.203. Raw data for Input Offset Voltage @ 5V, VCM=5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.58E-05 1.17E-04 1.67E-04 2.88E-04 2.93E-05 1.14E-04 5.22E-05 2.38E-04 -1.58E-04 2.19E-04 1.31E-04 10 5.69E-05 7.55E-05 1.52E-04 2.45E-04 6.19E-06 1.05E-04 4.47E-05 2.30E-04 -1.66E-04 2.10E-04 1.30E-04 20 6.20E-05 7.00E-05 1.58E-04 2.47E-04 9.22E-06 1.05E-04 4.38E-05 2.31E-04 -1.63E-04 2.12E-04 1.30E-04 30 6.15E-05 6.84E-05 1.62E-04 2.52E-04 2.06E-05 1.05E-04 4.70E-05 2.34E-04 -1.63E-04 2.13E-04 1.30E-04 50 5.56E-05 5.33E-05 1.62E-04 2.47E-04 1.88E-05 1.07E-04 4.90E-05 2.34E-04 -1.60E-04 2.16E-04 1.30E-04 60 5.67E-05 5.38E-05 1.64E-04 2.49E-04 1.86E-05 1.09E-04 4.80E-05 2.35E-04 -1.58E-04 2.17E-04 1.29E-04 70 4.39E-05 6.68E-05 1.47E-04 2.62E-04 2.32E-05 1.10E-04 3.43E-05 2.28E-04 -1.66E-04 2.05E-04 1.28E-04 1.36E-04 9.94E-05 4.08E-04 -1.37E-04 1.07E-04 9.31E-05 3.62E-04 -1.48E-04 1.09E-04 9.36E-05 3.66E-04 -1.47E-04 1.13E-04 9.35E-05 3.69E-04 -1.43E-04 1.07E-04 9.48E-05 3.67E-04 -1.53E-04 1.09E-04 9.57E-05 3.71E-04 -1.54E-04 1.09E-04 9.79E-05 3.77E-04 -1.60E-04 9.31E-05 1.60E-04 5.31E-04 -3.44E-04 -8.00E-04 PASS 8.00E-04 PASS 8.47E-05 1.59E-04 5.22E-04 -3.52E-04 -9.50E-04 PASS 9.50E-04 PASS 8.57E-05 1.59E-04 5.21E-04 -3.50E-04 -9.50E-04 PASS 9.50E-04 PASS 8.75E-05 1.60E-04 5.25E-04 -3.50E-04 -9.50E-04 PASS 9.50E-04 PASS 8.91E-05 1.59E-04 5.25E-04 -3.47E-04 -9.50E-04 PASS 9.50E-04 PASS 9.02E-05 1.59E-04 5.26E-04 -3.45E-04 -9.50E-04 PASS 9.50E-04 PASS 8.22E-05 1.59E-04 5.17E-04 -3.53E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 414 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Voltage @ 5V, VCM=5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.50E-03 1.00E-03 5.00E-04 0.00E+00 -5.00E-04 -1.00E-03 -1.50E-03 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.204. Plot of Input Offset Voltage @ 5V, VCM=5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 415 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.204. Raw data for Input Offset Voltage @ 5V, VCM=5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @ 5V, VCM=5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -4.39E-05 3.01E-04 -1.54E-04 1.24E-04 -1.70E-04 1.55E-04 7.86E-05 5.95E-05 4.16E-04 6.59E-05 3.87E-05 10 -5.14E-05 2.82E-04 -1.76E-04 1.07E-04 -1.85E-04 1.49E-04 7.26E-05 5.66E-05 4.01E-04 6.49E-05 3.71E-05 20 -3.74E-05 2.84E-04 -1.69E-04 1.15E-04 -1.76E-04 1.51E-04 7.48E-05 6.06E-05 4.05E-04 6.56E-05 3.66E-05 30 -2.96E-05 2.85E-04 -1.67E-04 1.21E-04 -1.68E-04 1.50E-04 7.60E-05 6.16E-05 4.06E-04 6.49E-05 3.66E-05 50 -1.82E-05 2.85E-04 -1.73E-04 1.28E-04 -1.64E-04 1.51E-04 7.55E-05 6.71E-05 4.08E-04 6.35E-05 3.66E-05 60 -1.78E-05 2.87E-04 -1.71E-04 1.27E-04 -1.62E-04 1.52E-04 7.72E-05 6.65E-05 4.12E-04 6.56E-05 3.63E-05 70 -2.70E-05 2.85E-04 -1.68E-04 1.24E-04 -1.67E-04 1.50E-04 7.38E-05 6.29E-05 4.01E-04 5.97E-05 3.52E-05 1.13E-05 2.00E-04 5.59E-04 -5.37E-04 -4.68E-06 1.99E-04 5.42E-04 -5.51E-04 3.35E-06 1.97E-04 5.43E-04 -5.36E-04 8.34E-06 1.95E-04 5.43E-04 -5.27E-04 1.15E-05 1.96E-04 5.49E-04 -5.26E-04 1.25E-05 1.96E-04 5.50E-04 -5.25E-04 9.38E-06 1.96E-04 5.46E-04 -5.27E-04 1.55E-04 1.51E-04 5.68E-04 -2.58E-04 -8.00E-04 PASS 8.00E-04 PASS 1.49E-04 1.46E-04 5.49E-04 -2.51E-04 -9.50E-04 PASS 9.50E-04 PASS 1.51E-04 1.46E-04 5.52E-04 -2.50E-04 -9.50E-04 PASS 9.50E-04 PASS 1.52E-04 1.47E-04 5.55E-04 -2.51E-04 -9.50E-04 PASS 9.50E-04 PASS 1.53E-04 1.47E-04 5.57E-04 -2.51E-04 -9.50E-04 PASS 9.50E-04 PASS 1.55E-04 1.48E-04 5.61E-04 -2.52E-04 -9.50E-04 PASS 9.50E-04 PASS 1.49E-04 1.45E-04 5.48E-04 -2.49E-04 -9.50E-04 PASS 9.50E-04 PASS An ISO 9001:2000 Certified Company 416 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=5V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.205. Plot of Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 417 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.205. Raw data for Input Offset Current @ 5V, VCM=5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=5V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.10E-09 9.89E-09 7.85E-09 -5.33E-09 6.77E-09 -1.09E-08 -2.57E-08 -2.68E-09 -3.80E-09 7.72E-09 -6.26E-09 10 5.96E-09 1.03E-08 8.01E-09 -4.26E-09 1.11E-08 -9.68E-09 -2.78E-08 -9.81E-10 -3.64E-09 9.39E-09 -6.25E-09 20 4.59E-09 8.75E-09 6.82E-09 -5.27E-09 1.29E-08 -1.06E-08 -2.84E-08 -1.83E-09 -2.19E-09 1.06E-08 -6.25E-09 30 4.98E-09 7.68E-09 6.77E-09 -5.93E-09 9.64E-09 -9.59E-09 -2.77E-08 -2.36E-09 -2.97E-09 9.26E-09 -6.21E-09 50 6.07E-09 7.44E-09 7.06E-09 -6.18E-09 9.14E-09 -9.11E-09 -2.81E-08 -2.88E-09 -3.60E-09 9.91E-09 -6.04E-09 60 5.93E-09 7.25E-09 6.84E-09 -5.66E-09 9.30E-09 -8.53E-09 -2.79E-08 -2.97E-09 -3.35E-09 1.00E-08 -6.05E-09 70 4.12E-09 9.07E-09 7.38E-09 -5.77E-09 8.33E-09 -1.08E-08 -2.85E-08 -2.21E-09 -4.30E-09 8.62E-09 -6.17E-09 5.05E-09 5.98E-09 2.15E-08 -1.13E-08 6.22E-09 6.20E-09 2.32E-08 -1.08E-08 5.56E-09 6.79E-09 2.42E-08 -1.31E-08 4.63E-09 6.13E-09 2.14E-08 -1.22E-08 4.71E-09 6.19E-09 2.17E-08 -1.23E-08 4.73E-09 5.94E-09 2.10E-08 -1.15E-08 4.63E-09 6.11E-09 2.14E-08 -1.21E-08 -7.07E-09 1.24E-08 2.68E-08 -4.09E-08 -6.50E-08 PASS 6.50E-08 PASS -6.55E-09 1.38E-08 3.12E-08 -4.43E-08 -6.50E-08 PASS 6.50E-08 PASS -6.48E-09 1.44E-08 3.30E-08 -4.59E-08 -6.50E-08 PASS 6.50E-08 PASS -6.68E-09 1.36E-08 3.06E-08 -4.39E-08 -6.50E-08 PASS 6.50E-08 PASS -6.75E-09 1.38E-08 3.11E-08 -4.46E-08 -6.50E-08 PASS 6.50E-08 PASS -6.56E-09 1.38E-08 3.12E-08 -4.43E-08 -6.50E-08 PASS 6.50E-08 PASS -7.44E-09 1.37E-08 3.01E-08 -4.50E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 418 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=5V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.206. Plot of Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 419 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.206. Raw data for Input Offset Current @ 5V, VCM=5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=5V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.29E-08 -2.24E-08 -1.49E-09 7.02E-09 6.15E-09 5.23E-09 1.38E-08 -4.28E-09 1.25E-09 -5.47E-09 -4.01E-10 10 1.31E-08 -2.11E-08 -6.41E-10 7.45E-09 6.99E-09 9.92E-09 1.48E-08 -3.20E-09 -3.92E-10 -5.45E-09 -3.93E-10 20 1.29E-08 -2.14E-08 -1.15E-09 6.86E-09 5.77E-09 9.51E-09 1.53E-08 -3.73E-09 -8.22E-10 -5.15E-09 -4.98E-10 30 1.21E-08 -2.20E-08 1.80E-11 6.09E-09 5.30E-09 8.98E-09 1.55E-08 -2.64E-09 -3.03E-09 -4.28E-09 -4.09E-10 50 1.61E-08 -1.39E-08 3.20E-10 5.97E-09 6.01E-09 8.89E-09 1.54E-08 -4.81E-09 -3.40E-09 -4.50E-09 -4.05E-10 60 1.65E-08 -1.39E-08 4.00E-12 5.60E-09 5.15E-09 8.72E-09 1.60E-08 -3.87E-09 -2.76E-09 -3.41E-09 -3.85E-10 70 1.37E-08 -2.09E-08 -1.37E-10 5.83E-09 5.57E-09 7.56E-09 1.41E-08 -3.60E-09 -2.21E-09 -5.58E-09 -4.75E-10 4.28E-10 1.38E-08 3.82E-08 -3.73E-08 1.17E-09 1.34E-08 3.79E-08 -3.55E-08 5.88E-10 1.33E-08 3.69E-08 -3.58E-08 3.01E-10 1.32E-08 3.65E-08 -3.59E-08 2.90E-09 1.09E-08 3.29E-08 -2.71E-08 2.68E-09 1.10E-08 3.29E-08 -2.76E-08 8.14E-10 1.31E-08 3.67E-08 -3.51E-08 2.10E-09 7.82E-09 2.35E-08 -1.93E-08 -6.50E-08 PASS 6.50E-08 PASS 3.14E-09 8.80E-09 2.73E-08 -2.10E-08 -6.50E-08 PASS 6.50E-08 PASS 3.02E-09 8.93E-09 2.75E-08 -2.15E-08 -6.50E-08 PASS 6.50E-08 PASS 2.91E-09 8.86E-09 2.72E-08 -2.14E-08 -6.50E-08 PASS 6.50E-08 PASS 2.32E-09 9.28E-09 2.78E-08 -2.31E-08 -6.50E-08 PASS 6.50E-08 PASS 2.93E-09 8.98E-09 2.76E-08 -2.17E-08 -6.50E-08 PASS 6.50E-08 PASS 2.05E-09 8.42E-09 2.51E-08 -2.10E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 420 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=5V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.207. Plot of Input Offset Current @ 5V, VCM=5V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 421 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.207. Raw data for Input Offset Current @ 5V, VCM=5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=5V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.07E-08 -1.85E-08 -1.67E-08 1.30E-08 -3.62E-09 -5.12E-10 3.16E-09 -8.83E-10 -7.03E-10 6.58E-10 -2.42E-09 10 1.18E-08 -1.85E-08 -1.58E-08 1.18E-08 -4.51E-09 -4.88E-10 3.27E-09 1.08E-09 -8.80E-11 8.22E-10 -2.39E-09 20 1.21E-08 -1.87E-08 -1.60E-08 1.07E-08 -5.39E-09 -3.28E-10 3.46E-09 -5.60E-11 4.65E-10 1.70E-10 -2.36E-09 30 1.06E-08 -1.74E-08 -1.55E-08 1.09E-08 -4.18E-09 -1.14E-10 4.81E-09 2.30E-09 8.03E-10 2.30E-10 -2.47E-09 50 1.07E-08 -1.82E-08 -1.66E-08 1.09E-08 -4.50E-09 2.81E-10 3.43E-09 1.05E-09 4.43E-10 -2.42E-10 -2.34E-09 60 1.10E-08 -1.80E-08 -1.65E-08 1.12E-08 -4.75E-09 1.00E-09 3.30E-09 1.07E-09 1.43E-09 2.01E-10 -2.41E-09 70 1.04E-08 -1.75E-08 -1.54E-08 1.16E-08 -4.06E-09 -3.43E-10 2.14E-09 1.91E-10 -4.70E-10 -1.36E-09 -2.39E-09 -3.03E-09 1.47E-08 3.74E-08 -4.34E-08 -3.04E-09 1.45E-08 3.67E-08 -4.28E-08 -3.45E-09 1.44E-08 3.61E-08 -4.30E-08 -3.10E-09 1.36E-08 3.42E-08 -4.04E-08 -3.53E-09 1.41E-08 3.52E-08 -4.23E-08 -3.42E-09 1.42E-08 3.55E-08 -4.24E-08 -2.98E-09 1.38E-08 3.48E-08 -4.08E-08 3.44E-10 1.69E-09 4.97E-09 -4.28E-09 -6.50E-08 PASS 6.50E-08 PASS 9.20E-10 1.46E-09 4.93E-09 -3.09E-09 -6.50E-08 PASS 6.50E-08 PASS 7.41E-10 1.55E-09 4.98E-09 -3.50E-09 -6.50E-08 PASS 6.50E-08 PASS 1.61E-09 2.02E-09 7.14E-09 -3.92E-09 -6.50E-08 PASS 6.50E-08 PASS 9.92E-10 1.44E-09 4.93E-09 -2.95E-09 -6.50E-08 PASS 6.50E-08 PASS 1.40E-09 1.15E-09 4.56E-09 -1.76E-09 -6.50E-08 PASS 6.50E-08 PASS 3.06E-11 1.30E-09 3.60E-09 -3.54E-09 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 422 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ 5V, VCM=5V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 8.00E-08 6.00E-08 4.00E-08 2.00E-08 0.00E+00 -2.00E-08 -4.00E-08 -6.00E-08 -8.00E-08 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.208. Plot of Input Offset Current @ 5V, VCM=5V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 423 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.208. Raw data for Input Offset Current @ 5V, VCM=5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @ 5V, VCM=5V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.22E-08 -1.49E-09 -6.38E-09 -1.21E-08 6.83E-09 -8.71E-09 2.39E-09 1.36E-08 1.64E-09 -8.92E-09 -5.64E-09 10 1.18E-08 -4.68E-10 -5.95E-09 -1.26E-08 6.88E-09 -8.39E-09 2.13E-09 1.44E-08 5.13E-10 -7.64E-09 -5.52E-09 20 1.15E-08 -4.67E-10 -6.44E-09 -1.24E-08 6.47E-09 -7.52E-09 1.82E-09 1.32E-08 1.17E-09 -7.47E-09 -5.41E-09 30 1.10E-08 -9.39E-10 -5.70E-09 -1.21E-08 6.13E-09 -7.90E-09 2.17E-09 1.28E-08 5.75E-10 -7.57E-09 -5.50E-09 50 1.15E-08 -1.32E-09 -5.81E-09 -1.20E-08 6.82E-09 -8.44E-09 1.32E-09 1.21E-08 1.89E-09 -9.34E-09 -5.32E-09 60 1.15E-08 -1.04E-09 -5.16E-09 -1.24E-08 6.91E-09 -7.55E-09 1.52E-09 1.17E-08 1.73E-09 -8.29E-09 -5.39E-09 70 1.14E-08 -7.69E-10 -4.94E-09 -1.20E-08 6.37E-09 -8.26E-09 1.58E-09 1.37E-08 1.85E-09 -8.48E-09 -5.42E-09 -1.91E-10 9.79E-09 2.66E-08 -2.70E-08 -7.14E-11 9.78E-09 2.68E-08 -2.69E-08 -2.70E-10 9.63E-09 2.61E-08 -2.67E-08 -3.19E-10 9.17E-09 2.48E-08 -2.55E-08 -1.55E-10 9.46E-09 2.58E-08 -2.61E-08 -3.60E-11 9.50E-09 2.60E-08 -2.61E-08 4.80E-12 9.23E-09 2.53E-08 -2.53E-08 -5.80E-12 9.33E-09 2.56E-08 -2.56E-08 -6.50E-08 PASS 6.50E-08 PASS 2.11E-10 9.24E-09 2.56E-08 -2.51E-08 -6.50E-08 PASS 6.50E-08 PASS 2.37E-10 8.53E-09 2.36E-08 -2.31E-08 -6.50E-08 PASS 6.50E-08 PASS 1.46E-11 8.49E-09 2.33E-08 -2.33E-08 -6.50E-08 PASS 6.50E-08 PASS -4.92E-10 8.80E-09 2.36E-08 -2.46E-08 -6.50E-08 PASS 6.50E-08 PASS -1.70E-10 8.20E-09 2.23E-08 -2.27E-08 -6.50E-08 PASS 6.50E-08 PASS 7.72E-11 9.13E-09 2.51E-08 -2.50E-08 -6.50E-08 PASS 6.50E-08 PASS An ISO 9001:2000 Certified Company 424 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=5V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.209. Plot of Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 425 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.209. Raw data for Positive Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=5V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.73E-07 3.86E-07 3.82E-07 4.03E-07 4.21E-07 4.43E-07 4.04E-07 3.85E-07 4.15E-07 3.94E-07 4.43E-07 10 5.08E-07 4.06E-07 3.99E-07 4.21E-07 4.45E-07 4.86E-07 4.53E-07 4.25E-07 4.60E-07 4.34E-07 4.45E-07 20 5.27E-07 4.15E-07 4.08E-07 4.29E-07 4.57E-07 5.09E-07 4.78E-07 4.51E-07 4.88E-07 4.60E-07 4.44E-07 30 5.43E-07 4.24E-07 4.17E-07 4.36E-07 4.61E-07 5.28E-07 4.98E-07 4.67E-07 5.07E-07 4.76E-07 4.43E-07 50 5.69E-07 4.41E-07 4.31E-07 4.48E-07 4.73E-07 5.59E-07 5.30E-07 4.98E-07 5.38E-07 5.07E-07 4.44E-07 60 5.67E-07 4.37E-07 4.32E-07 4.48E-07 4.73E-07 5.56E-07 5.26E-07 4.93E-07 5.37E-07 5.02E-07 4.44E-07 70 5.30E-07 4.21E-07 4.15E-07 4.35E-07 4.56E-07 5.13E-07 4.82E-07 4.57E-07 4.90E-07 4.65E-07 4.45E-07 4.13E-07 3.71E-08 5.15E-07 3.11E-07 4.36E-07 4.41E-08 5.57E-07 3.15E-07 4.47E-07 4.85E-08 5.80E-07 3.14E-07 4.56E-07 5.14E-08 5.97E-07 3.15E-07 4.72E-07 5.62E-08 6.27E-07 3.18E-07 4.71E-07 5.54E-08 6.23E-07 3.19E-07 4.51E-07 4.69E-08 5.80E-07 3.23E-07 4.08E-07 2.25E-08 4.70E-07 3.46E-07 -6.50E-07 PASS 6.50E-07 PASS 4.52E-07 2.37E-08 5.17E-07 3.87E-07 -7.00E-07 PASS 7.00E-07 PASS 4.77E-07 2.30E-08 5.40E-07 4.14E-07 -7.50E-07 PASS 7.50E-07 PASS 4.95E-07 2.45E-08 5.63E-07 4.28E-07 -7.50E-07 PASS 7.50E-07 PASS 5.27E-07 2.45E-08 5.94E-07 4.59E-07 -8.00E-07 PASS 8.00E-07 PASS 5.23E-07 2.56E-08 5.93E-07 4.52E-07 -8.00E-07 PASS 8.00E-07 PASS 4.82E-07 2.21E-08 5.42E-07 4.21E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 426 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=5V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.210. Plot of Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 427 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.210. Raw data for Positive Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=5V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.49E-07 4.38E-07 4.14E-07 4.42E-07 4.66E-07 3.53E-07 4.29E-07 4.43E-07 4.16E-07 3.90E-07 3.90E-07 10 4.81E-07 4.58E-07 4.35E-07 4.63E-07 4.87E-07 3.94E-07 4.71E-07 4.88E-07 4.69E-07 4.35E-07 3.93E-07 20 5.00E-07 4.70E-07 4.45E-07 4.72E-07 4.97E-07 4.17E-07 4.94E-07 5.13E-07 4.95E-07 4.60E-07 3.90E-07 30 5.14E-07 4.81E-07 4.53E-07 4.80E-07 5.04E-07 4.32E-07 5.11E-07 5.33E-07 5.10E-07 4.83E-07 3.91E-07 50 5.38E-07 4.98E-07 4.69E-07 4.96E-07 5.20E-07 4.61E-07 5.42E-07 5.64E-07 5.45E-07 5.13E-07 3.86E-07 60 5.36E-07 4.97E-07 4.67E-07 4.95E-07 5.20E-07 4.57E-07 5.39E-07 5.61E-07 5.46E-07 5.09E-07 3.92E-07 70 5.02E-07 4.77E-07 4.52E-07 4.76E-07 5.02E-07 4.22E-07 4.96E-07 5.22E-07 5.00E-07 4.67E-07 3.94E-07 4.42E-07 1.88E-08 4.93E-07 3.90E-07 4.65E-07 2.06E-08 5.21E-07 4.08E-07 4.77E-07 2.26E-08 5.39E-07 4.15E-07 4.86E-07 2.37E-08 5.51E-07 4.21E-07 5.04E-07 2.64E-08 5.77E-07 4.32E-07 5.03E-07 2.60E-08 5.75E-07 4.32E-07 4.82E-07 2.09E-08 5.39E-07 4.24E-07 4.06E-07 3.55E-08 5.04E-07 3.09E-07 -6.50E-07 PASS 6.50E-07 PASS 4.51E-07 3.72E-08 5.53E-07 3.49E-07 -7.00E-07 PASS 7.00E-07 PASS 4.76E-07 3.79E-08 5.80E-07 3.72E-07 -7.50E-07 PASS 7.50E-07 PASS 4.94E-07 3.89E-08 6.00E-07 3.87E-07 -7.50E-07 PASS 7.50E-07 PASS 5.25E-07 4.01E-08 6.35E-07 4.15E-07 -8.00E-07 PASS 8.00E-07 PASS 5.22E-07 4.13E-08 6.35E-07 4.09E-07 -8.00E-07 PASS 8.00E-07 PASS 4.81E-07 3.87E-08 5.87E-07 3.75E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 428 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=5V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.211. Plot of Positive Input Bias Current @ 5V, VCM=5V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 429 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.211. Raw data for Positive Input Bias Current @ 5V, VCM=5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=5V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.42E-07 4.39E-07 4.11E-07 4.47E-07 4.46E-07 3.55E-07 4.18E-07 4.51E-07 4.17E-07 3.90E-07 3.86E-07 10 4.73E-07 4.62E-07 4.28E-07 4.70E-07 4.68E-07 3.95E-07 4.55E-07 4.97E-07 4.65E-07 4.35E-07 3.86E-07 20 4.91E-07 4.75E-07 4.39E-07 4.82E-07 4.80E-07 4.18E-07 4.78E-07 5.23E-07 4.93E-07 4.62E-07 3.87E-07 30 5.04E-07 4.84E-07 4.47E-07 4.88E-07 4.89E-07 4.35E-07 4.98E-07 5.43E-07 5.12E-07 4.80E-07 3.85E-07 50 5.26E-07 5.00E-07 4.61E-07 5.05E-07 5.04E-07 4.64E-07 5.28E-07 5.74E-07 5.45E-07 5.13E-07 3.85E-07 60 5.24E-07 4.99E-07 4.61E-07 5.07E-07 5.03E-07 4.60E-07 5.24E-07 5.70E-07 5.41E-07 5.09E-07 3.86E-07 70 4.92E-07 4.79E-07 4.45E-07 4.84E-07 4.86E-07 4.24E-07 4.81E-07 5.29E-07 4.96E-07 4.66E-07 3.88E-07 4.37E-07 1.50E-08 4.78E-07 3.96E-07 4.60E-07 1.83E-08 5.11E-07 4.10E-07 4.73E-07 1.98E-08 5.28E-07 4.19E-07 4.83E-07 2.11E-08 5.41E-07 4.25E-07 4.99E-07 2.39E-08 5.65E-07 4.34E-07 4.99E-07 2.33E-08 5.63E-07 4.35E-07 4.77E-07 1.86E-08 5.28E-07 4.26E-07 4.06E-07 3.59E-08 5.05E-07 3.08E-07 -6.50E-07 PASS 6.50E-07 PASS 4.50E-07 3.80E-08 5.54E-07 3.45E-07 -7.00E-07 PASS 7.00E-07 PASS 4.75E-07 3.90E-08 5.82E-07 3.68E-07 -7.50E-07 PASS 7.50E-07 PASS 4.93E-07 4.00E-08 6.03E-07 3.84E-07 -7.50E-07 PASS 7.50E-07 PASS 5.25E-07 4.07E-08 6.37E-07 4.13E-07 -8.00E-07 PASS 8.00E-07 PASS 5.21E-07 4.10E-08 6.33E-07 4.08E-07 -8.00E-07 PASS 8.00E-07 PASS 4.79E-07 3.86E-08 5.85E-07 3.73E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 430 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Positive Input Bias Current @ 5V, VCM=5V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.212. Plot of Positive Input Bias Current @ 5V, VCM=5V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 431 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.212. Raw data for Positive Input Bias Current @ 5V, VCM=5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @ 5V, VCM=5V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.80E-07 3.79E-07 3.75E-07 4.10E-07 4.30E-07 4.36E-07 4.12E-07 3.96E-07 4.12E-07 3.79E-07 4.43E-07 10 5.12E-07 3.99E-07 3.91E-07 4.25E-07 4.47E-07 4.79E-07 4.57E-07 4.39E-07 4.55E-07 4.17E-07 4.43E-07 20 5.30E-07 4.13E-07 4.00E-07 4.35E-07 4.55E-07 5.04E-07 4.83E-07 4.62E-07 4.81E-07 4.40E-07 4.45E-07 30 5.44E-07 4.21E-07 4.12E-07 4.41E-07 4.61E-07 5.20E-07 5.01E-07 4.80E-07 5.01E-07 4.56E-07 4.43E-07 50 5.69E-07 4.38E-07 4.24E-07 4.54E-07 4.75E-07 5.51E-07 5.35E-07 5.10E-07 5.34E-07 4.85E-07 4.43E-07 60 5.65E-07 4.37E-07 4.23E-07 4.53E-07 4.74E-07 5.49E-07 5.31E-07 5.06E-07 5.28E-07 4.81E-07 4.42E-07 70 5.33E-07 4.16E-07 4.06E-07 4.39E-07 4.59E-07 5.06E-07 4.86E-07 4.70E-07 4.87E-07 4.47E-07 4.45E-07 4.15E-07 4.29E-08 5.32E-07 2.97E-07 4.35E-07 4.85E-08 5.68E-07 3.02E-07 4.46E-07 5.14E-08 5.87E-07 3.05E-07 4.56E-07 5.30E-08 6.01E-07 3.10E-07 4.72E-07 5.76E-08 6.30E-07 3.14E-07 4.70E-07 5.60E-08 6.24E-07 3.17E-07 4.51E-07 5.06E-08 5.90E-07 3.12E-07 4.07E-07 2.14E-08 4.66E-07 3.48E-07 -6.50E-07 PASS 6.50E-07 PASS 4.50E-07 2.33E-08 5.13E-07 3.86E-07 -7.00E-07 PASS 7.00E-07 PASS 4.74E-07 2.42E-08 5.40E-07 4.07E-07 -7.50E-07 PASS 7.50E-07 PASS 4.92E-07 2.43E-08 5.58E-07 4.25E-07 -7.50E-07 PASS 7.50E-07 PASS 5.23E-07 2.57E-08 5.94E-07 4.53E-07 -8.00E-07 PASS 8.00E-07 PASS 5.19E-07 2.62E-08 5.91E-07 4.47E-07 -8.00E-07 PASS 8.00E-07 PASS 4.79E-07 2.21E-08 5.40E-07 4.18E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 432 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=5V #1 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.213. Plot of Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 433 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.213. Raw data for Negative Input Bias Current @ 5V, VCM=5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=5V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.69E-07 3.73E-07 3.71E-07 4.09E-07 4.14E-07 4.53E-07 4.31E-07 3.85E-07 4.16E-07 3.84E-07 4.48E-07 10 5.02E-07 3.94E-07 3.89E-07 4.25E-07 4.33E-07 4.94E-07 4.80E-07 4.26E-07 4.63E-07 4.25E-07 4.49E-07 20 5.21E-07 4.06E-07 4.02E-07 4.34E-07 4.43E-07 5.19E-07 5.06E-07 4.51E-07 4.90E-07 4.47E-07 4.50E-07 30 5.36E-07 4.15E-07 4.08E-07 4.40E-07 4.51E-07 5.35E-07 5.25E-07 4.68E-07 5.10E-07 4.66E-07 4.47E-07 50 5.62E-07 4.33E-07 4.25E-07 4.54E-07 4.64E-07 5.68E-07 5.57E-07 4.99E-07 5.43E-07 4.96E-07 4.48E-07 60 5.58E-07 4.31E-07 4.25E-07 4.53E-07 4.62E-07 5.64E-07 5.54E-07 4.95E-07 5.38E-07 4.92E-07 4.48E-07 70 5.25E-07 4.11E-07 4.07E-07 4.40E-07 4.47E-07 5.24E-07 5.11E-07 4.59E-07 4.93E-07 4.56E-07 4.51E-07 4.07E-07 3.99E-08 5.17E-07 2.98E-07 4.29E-07 4.53E-08 5.53E-07 3.04E-07 4.41E-07 4.79E-08 5.73E-07 3.10E-07 4.50E-07 5.13E-08 5.91E-07 3.10E-07 4.68E-07 5.50E-08 6.18E-07 3.17E-07 4.66E-07 5.38E-08 6.13E-07 3.18E-07 4.46E-07 4.76E-08 5.77E-07 3.16E-07 4.14E-07 2.97E-08 4.95E-07 3.33E-07 -6.50E-07 PASS 6.50E-07 PASS 4.58E-07 3.12E-08 5.43E-07 3.72E-07 -7.00E-07 PASS 7.00E-07 PASS 4.83E-07 3.20E-08 5.71E-07 3.95E-07 -7.50E-07 PASS 7.50E-07 PASS 5.01E-07 3.22E-08 5.89E-07 4.13E-07 -7.50E-07 PASS 7.50E-07 PASS 5.33E-07 3.32E-08 6.24E-07 4.42E-07 -8.00E-07 PASS 8.00E-07 PASS 5.29E-07 3.32E-08 6.20E-07 4.38E-07 -8.00E-07 PASS 8.00E-07 PASS 4.89E-07 3.03E-08 5.72E-07 4.05E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 434 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=5V #2 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.214. Plot of Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 435 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.214. Raw data for Negative Input Bias Current @ 5V, VCM=5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=5V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.35E-07 4.57E-07 4.16E-07 4.35E-07 4.58E-07 3.46E-07 4.15E-07 4.46E-07 4.13E-07 3.98E-07 3.86E-07 10 4.66E-07 4.80E-07 4.34E-07 4.54E-07 4.79E-07 3.84E-07 4.55E-07 4.91E-07 4.68E-07 4.38E-07 3.88E-07 20 4.86E-07 4.91E-07 4.45E-07 4.66E-07 4.90E-07 4.07E-07 4.77E-07 5.16E-07 4.96E-07 4.66E-07 3.92E-07 30 4.97E-07 5.02E-07 4.53E-07 4.73E-07 4.97E-07 4.23E-07 4.96E-07 5.35E-07 5.20E-07 4.84E-07 3.89E-07 50 5.22E-07 5.13E-07 4.69E-07 4.89E-07 5.13E-07 4.51E-07 5.24E-07 5.70E-07 5.44E-07 5.15E-07 3.89E-07 60 5.19E-07 5.12E-07 4.68E-07 4.88E-07 5.15E-07 4.49E-07 5.22E-07 5.65E-07 5.40E-07 5.11E-07 3.92E-07 70 4.88E-07 4.96E-07 4.51E-07 4.70E-07 4.96E-07 4.14E-07 4.81E-07 5.25E-07 4.96E-07 4.70E-07 3.92E-07 4.40E-07 1.77E-08 4.89E-07 3.92E-07 4.63E-07 1.91E-08 5.15E-07 4.10E-07 4.76E-07 2.00E-08 5.31E-07 4.21E-07 4.84E-07 2.10E-08 5.42E-07 4.27E-07 5.01E-07 2.20E-08 5.61E-07 4.41E-07 5.00E-07 2.17E-08 5.60E-07 4.41E-07 4.80E-07 1.92E-08 5.33E-07 4.27E-07 4.04E-07 3.65E-08 5.04E-07 3.04E-07 -6.50E-07 PASS 6.50E-07 PASS 4.47E-07 4.02E-08 5.57E-07 3.37E-07 -7.00E-07 PASS 7.00E-07 PASS 4.72E-07 4.10E-08 5.85E-07 3.60E-07 -7.50E-07 PASS 7.50E-07 PASS 4.91E-07 4.32E-08 6.10E-07 3.73E-07 -7.50E-07 PASS 7.50E-07 PASS 5.21E-07 4.43E-08 6.42E-07 3.99E-07 -8.00E-07 PASS 8.00E-07 PASS 5.17E-07 4.36E-08 6.37E-07 3.98E-07 -8.00E-07 PASS 8.00E-07 PASS 4.77E-07 4.08E-08 5.89E-07 3.66E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 436 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=5V #3 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.215. Plot of Negative Input Bias Current @ 5V, VCM=5V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 437 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.215. Raw data for Negative Input Bias Current @ 5V, VCM=5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=5V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.30E-07 4.57E-07 4.27E-07 4.35E-07 4.49E-07 3.57E-07 4.11E-07 4.51E-07 4.19E-07 3.91E-07 3.88E-07 10 4.60E-07 4.80E-07 4.44E-07 4.58E-07 4.71E-07 3.95E-07 4.52E-07 4.96E-07 4.65E-07 4.35E-07 3.88E-07 20 4.77E-07 4.92E-07 4.54E-07 4.68E-07 4.84E-07 4.17E-07 4.74E-07 5.22E-07 4.91E-07 4.61E-07 3.89E-07 30 4.92E-07 5.01E-07 4.61E-07 4.76E-07 4.91E-07 4.34E-07 4.91E-07 5.40E-07 5.11E-07 4.80E-07 3.87E-07 50 5.16E-07 5.18E-07 4.78E-07 4.94E-07 5.08E-07 4.61E-07 5.25E-07 5.73E-07 5.43E-07 5.12E-07 3.89E-07 60 5.12E-07 5.16E-07 4.77E-07 4.93E-07 5.07E-07 4.58E-07 5.21E-07 5.69E-07 5.38E-07 5.07E-07 3.87E-07 70 4.82E-07 4.95E-07 4.61E-07 4.72E-07 4.88E-07 4.24E-07 4.80E-07 5.28E-07 4.96E-07 4.69E-07 3.90E-07 4.40E-07 1.29E-08 4.75E-07 4.04E-07 4.63E-07 1.37E-08 5.00E-07 4.25E-07 4.75E-07 1.47E-08 5.16E-07 4.35E-07 4.84E-07 1.60E-08 5.28E-07 4.40E-07 5.03E-07 1.69E-08 5.49E-07 4.57E-07 5.01E-07 1.62E-08 5.45E-07 4.57E-07 4.79E-07 1.35E-08 5.16E-07 4.42E-07 4.06E-07 3.46E-08 5.00E-07 3.11E-07 -6.50E-07 PASS 6.50E-07 PASS 4.49E-07 3.76E-08 5.52E-07 3.45E-07 -7.00E-07 PASS 7.00E-07 PASS 4.73E-07 3.87E-08 5.79E-07 3.67E-07 -7.50E-07 PASS 7.50E-07 PASS 4.91E-07 3.95E-08 5.99E-07 3.83E-07 -7.50E-07 PASS 7.50E-07 PASS 5.23E-07 4.13E-08 6.36E-07 4.10E-07 -8.00E-07 PASS 8.00E-07 PASS 5.19E-07 4.09E-08 6.31E-07 4.07E-07 -8.00E-07 PASS 8.00E-07 PASS 4.79E-07 3.80E-08 5.84E-07 3.75E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 438 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Negative Input Bias Current @ 5V, VCM=5V #4 (A) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Biased Ps90%/90% (-KTL) Un-Biased Ps90%/90% (+KTL) Biased Ps90%/90% (+KTL) Un-Biased Specification MIN Specification MAX 1.00E-06 8.00E-07 6.00E-07 4.00E-07 2.00E-07 0.00E+00 -2.00E-07 -4.00E-07 -6.00E-07 -8.00E-07 -1.00E-06 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.216. Plot of Negative Input Bias Current @ 5V, VCM=5V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 439 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.216. Raw data for Negative Input Bias Current @ 5V, VCM=5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @ 5V, VCM=5V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.68E-07 3.77E-07 3.77E-07 4.20E-07 4.22E-07 4.43E-07 4.08E-07 3.84E-07 4.09E-07 3.85E-07 4.46E-07 10 4.99E-07 3.99E-07 3.95E-07 4.34E-07 4.40E-07 4.85E-07 4.56E-07 4.23E-07 4.54E-07 4.24E-07 4.48E-07 20 5.17E-07 4.12E-07 4.06E-07 4.46E-07 4.48E-07 5.10E-07 4.81E-07 4.49E-07 4.81E-07 4.47E-07 4.47E-07 30 5.32E-07 4.21E-07 4.12E-07 4.52E-07 4.54E-07 5.29E-07 5.00E-07 4.66E-07 5.00E-07 4.65E-07 4.46E-07 50 5.56E-07 4.38E-07 4.28E-07 4.65E-07 4.68E-07 5.60E-07 5.31E-07 4.98E-07 5.32E-07 4.94E-07 4.48E-07 60 5.54E-07 4.36E-07 4.27E-07 4.65E-07 4.66E-07 5.57E-07 5.29E-07 4.94E-07 5.28E-07 4.90E-07 4.47E-07 70 5.24E-07 4.16E-07 4.11E-07 4.50E-07 4.53E-07 5.15E-07 4.85E-07 4.56E-07 4.85E-07 4.55E-07 4.48E-07 4.13E-07 3.78E-08 5.16E-07 3.09E-07 4.33E-07 4.17E-08 5.48E-07 3.19E-07 4.46E-07 4.42E-08 5.67E-07 3.24E-07 4.54E-07 4.74E-08 5.84E-07 3.24E-07 4.71E-07 5.07E-08 6.10E-07 3.32E-07 4.70E-07 5.00E-08 6.07E-07 3.33E-07 4.51E-07 4.50E-08 5.74E-07 3.27E-07 4.06E-07 2.41E-08 4.72E-07 3.40E-07 -6.50E-07 PASS 6.50E-07 PASS 4.48E-07 2.55E-08 5.18E-07 3.78E-07 -7.00E-07 PASS 7.00E-07 PASS 4.73E-07 2.62E-08 5.45E-07 4.02E-07 -7.50E-07 PASS 7.50E-07 PASS 4.92E-07 2.69E-08 5.66E-07 4.18E-07 -7.50E-07 PASS 7.50E-07 PASS 5.23E-07 2.71E-08 5.97E-07 4.49E-07 -8.00E-07 PASS 8.00E-07 PASS 5.20E-07 2.76E-08 5.96E-07 4.44E-07 -8.00E-07 PASS 8.00E-07 PASS 4.79E-07 2.49E-08 5.47E-07 4.11E-07 -8.00E-07 PASS 8.00E-07 PASS An ISO 9001:2000 Certified Company 440 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #1 (V/mV) 3.00E+03 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.217. Plot of Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 441 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.217. Raw data for Large Signal Voltage Gain @ 5V #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #1 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.93E+03 2.54E+03 3.13E+03 2.03E+03 2.82E+03 1.43E+03 1.92E+03 2.58E+03 1.93E+03 2.50E+03 2.45E+03 10 1.78E+03 1.88E+03 2.68E+03 1.95E+03 2.40E+03 2.27E+03 1.74E+03 2.35E+03 2.09E+03 2.89E+03 2.73E+03 20 1.73E+03 1.86E+03 2.57E+03 1.85E+03 2.28E+03 2.81E+03 2.06E+03 2.44E+03 2.01E+03 2.63E+03 2.45E+03 30 1.69E+03 1.91E+03 2.27E+03 1.74E+03 2.21E+03 2.17E+03 1.79E+03 2.22E+03 1.77E+03 2.29E+03 2.63E+03 50 1.48E+03 1.86E+03 1.98E+03 2.35E+03 2.38E+03 2.47E+03 1.65E+03 2.54E+03 1.74E+03 2.29E+03 2.72E+03 60 1.84E+03 2.22E+03 2.89E+03 1.92E+03 2.54E+03 2.21E+03 1.74E+03 2.36E+03 1.98E+03 2.94E+03 2.74E+03 70 1.63E+03 2.47E+03 2.80E+03 1.57E+03 2.53E+03 2.34E+03 1.83E+03 2.23E+03 1.86E+03 2.52E+03 2.62E+03 2.49E+03 5.13E+02 3.89E+03 1.08E+03 2.13E+03 3.84E+02 3.19E+03 1.08E+03 2.06E+03 3.54E+02 3.03E+03 1.09E+03 1.97E+03 2.65E+02 2.69E+03 1.24E+03 2.01E+03 3.73E+02 3.04E+03 9.90E+02 2.28E+03 4.40E+02 3.49E+03 1.08E+03 2.20E+03 5.62E+02 3.74E+03 6.60E+02 2.07E+03 4.75E+02 3.37E+03 7.69E+02 6.00E+02 PASS 2.27E+03 4.17E+02 3.41E+03 1.12E+03 3.00E+02 PASS 2.39E+03 3.50E+02 3.35E+03 1.43E+03 3.00E+02 PASS 2.05E+03 2.48E+02 2.73E+03 1.37E+03 3.00E+02 PASS 2.14E+03 4.16E+02 3.28E+03 1.00E+03 3.00E+02 PASS 2.25E+03 4.50E+02 3.48E+03 1.01E+03 3.00E+02 PASS 2.15E+03 3.05E+02 2.99E+03 1.32E+03 3.00E+02 PASS An ISO 9001:2000 Certified Company 442 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #2 (V/mV) 3.00E+03 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.218. Plot of Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 443 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.218. Raw data for Large Signal Voltage Gain @ 5V #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #2 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 2.24E+03 1.88E+03 2.19E+03 1.83E+03 1.97E+03 2.37E+03 3.67E+03 2.44E+03 2.69E+03 2.14E+03 3.23E+03 10 1.95E+03 1.76E+03 1.79E+03 2.73E+03 1.86E+03 1.80E+03 2.36E+03 2.55E+03 2.73E+03 2.23E+03 2.52E+03 20 1.69E+03 1.88E+03 1.77E+03 1.88E+03 2.11E+03 2.20E+03 2.57E+03 2.48E+03 2.65E+03 2.12E+03 2.31E+03 30 1.97E+03 1.96E+03 1.97E+03 2.62E+03 1.74E+03 2.22E+03 2.00E+03 3.31E+03 2.54E+03 2.02E+03 2.87E+03 50 1.91E+03 1.94E+03 1.94E+03 1.99E+03 2.52E+03 2.00E+03 1.90E+03 2.69E+03 2.18E+03 1.34E+03 2.95E+03 60 1.68E+03 1.71E+03 1.72E+03 1.91E+03 2.10E+03 1.97E+03 3.10E+03 2.33E+03 2.37E+03 2.09E+03 2.80E+03 70 2.42E+03 1.81E+03 1.75E+03 1.80E+03 1.80E+03 1.57E+03 2.29E+03 1.89E+03 2.08E+03 2.07E+03 2.68E+03 2.02E+03 1.84E+02 2.52E+03 1.52E+03 2.02E+03 4.03E+02 3.12E+03 9.13E+02 1.87E+03 1.57E+02 2.30E+03 1.44E+03 2.05E+03 3.31E+02 2.96E+03 1.15E+03 2.06E+03 2.60E+02 2.77E+03 1.35E+03 1.82E+03 1.78E+02 2.31E+03 1.34E+03 1.91E+03 2.82E+02 2.69E+03 1.14E+03 2.66E+03 5.96E+02 4.30E+03 1.03E+03 6.00E+02 PASS 2.33E+03 3.55E+02 3.31E+03 1.36E+03 3.00E+02 PASS 2.40E+03 2.34E+02 3.05E+03 1.76E+03 3.00E+02 PASS 2.42E+03 5.43E+02 3.91E+03 9.28E+02 3.00E+02 PASS 2.02E+03 4.85E+02 3.35E+03 6.89E+02 3.00E+02 PASS 2.37E+03 4.38E+02 3.57E+03 1.17E+03 3.00E+02 PASS 1.98E+03 2.71E+02 2.72E+03 1.24E+03 3.00E+02 PASS An ISO 9001:2000 Certified Company 444 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #3 (V/mV) 3.00E+03 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.219. Plot of Large Signal Voltage Gain @ 5V #3 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 445 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.219. Raw data for Large Signal Voltage Gain @ 5V #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #3 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 2.85E+03 2.61E+03 2.35E+03 3.50E+03 2.27E+03 2.99E+03 2.12E+03 2.06E+03 2.16E+03 1.93E+03 2.14E+03 10 2.49E+03 2.72E+03 1.72E+03 2.19E+03 2.42E+03 2.87E+03 2.28E+03 2.07E+03 1.88E+03 1.99E+03 2.08E+03 20 2.29E+03 2.03E+03 1.75E+03 1.63E+03 2.72E+03 2.40E+03 2.30E+03 2.08E+03 2.05E+03 2.06E+03 1.94E+03 30 2.49E+03 2.25E+03 1.71E+03 2.04E+03 2.30E+03 2.28E+03 1.97E+03 2.43E+03 1.98E+03 1.76E+03 2.01E+03 50 2.21E+03 2.12E+03 1.84E+03 1.45E+03 2.27E+03 2.64E+03 1.93E+03 1.96E+03 1.86E+03 1.60E+03 2.01E+03 60 2.10E+03 1.98E+03 1.86E+03 1.88E+03 1.79E+03 2.61E+03 2.95E+03 2.17E+03 2.19E+03 2.10E+03 2.23E+03 70 2.52E+03 2.67E+03 1.71E+03 1.86E+03 2.26E+03 2.50E+03 2.31E+03 1.83E+03 2.17E+03 2.05E+03 1.94E+03 2.72E+03 4.93E+02 4.07E+03 1.36E+03 2.31E+03 3.78E+02 3.34E+03 1.27E+03 2.08E+03 4.36E+02 3.28E+03 8.88E+02 2.16E+03 2.94E+02 2.96E+03 1.35E+03 1.98E+03 3.39E+02 2.91E+03 1.05E+03 1.92E+03 1.21E+02 2.26E+03 1.59E+03 2.20E+03 4.14E+02 3.34E+03 1.07E+03 2.25E+03 4.23E+02 3.41E+03 1.09E+03 6.00E+02 PASS 2.22E+03 3.92E+02 3.29E+03 1.14E+03 3.00E+02 PASS 2.18E+03 1.60E+02 2.62E+03 1.74E+03 3.00E+02 PASS 2.08E+03 2.69E+02 2.82E+03 1.34E+03 3.00E+02 PASS 2.00E+03 3.83E+02 3.05E+03 9.46E+02 3.00E+02 PASS 2.40E+03 3.66E+02 3.41E+03 1.40E+03 3.00E+02 PASS 2.17E+03 2.57E+02 2.88E+03 1.47E+03 3.00E+02 PASS An ISO 9001:2000 Certified Company 446 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #4 (V/mV) 2.50E+03 2.00E+03 1.50E+03 1.00E+03 5.00E+02 0.00E+00 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.220. Plot of Large Signal Voltage Gain @ 5V #4 (V/mV) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 447 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.220. Raw data for Large Signal Voltage Gain @ 5V #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #4 (V/mV) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 2.36E+03 1.88E+03 2.83E+03 2.27E+03 2.21E+03 2.19E+03 2.05E+03 2.38E+03 2.06E+03 2.07E+03 2.80E+03 10 1.91E+03 1.96E+03 2.48E+03 2.13E+03 1.89E+03 1.89E+03 1.56E+03 2.13E+03 2.19E+03 1.99E+03 2.43E+03 20 1.96E+03 1.91E+03 2.45E+03 2.18E+03 1.65E+03 2.78E+03 1.74E+03 2.00E+03 1.94E+03 1.92E+03 2.77E+03 30 1.99E+03 1.75E+03 2.54E+03 2.42E+03 1.71E+03 1.87E+03 1.87E+03 2.08E+03 1.87E+03 2.00E+03 3.39E+03 50 1.97E+03 1.61E+03 2.33E+03 1.93E+03 1.74E+03 2.30E+03 1.86E+03 1.96E+03 1.53E+03 1.96E+03 2.46E+03 60 2.20E+03 1.76E+03 2.37E+03 2.06E+03 1.70E+03 1.55E+03 2.20E+03 2.05E+03 1.94E+03 1.71E+03 2.05E+03 70 1.92E+03 1.81E+03 2.26E+03 2.13E+03 1.81E+03 1.78E+03 1.75E+03 1.79E+03 1.96E+03 1.76E+03 2.67E+03 2.31E+03 3.43E+02 3.25E+03 1.37E+03 2.07E+03 2.48E+02 2.75E+03 1.39E+03 2.03E+03 2.99E+02 2.85E+03 1.21E+03 2.08E+03 3.84E+02 3.13E+03 1.03E+03 1.92E+03 2.73E+02 2.67E+03 1.17E+03 2.02E+03 2.86E+02 2.80E+03 1.24E+03 1.98E+03 2.01E+02 2.53E+03 1.43E+03 2.15E+03 1.39E+02 2.53E+03 1.77E+03 6.00E+02 PASS 1.95E+03 2.48E+02 2.63E+03 1.27E+03 3.00E+02 PASS 2.07E+03 4.05E+02 3.18E+03 9.63E+02 3.00E+02 PASS 1.94E+03 9.80E+01 2.21E+03 1.67E+03 3.00E+02 PASS 1.92E+03 2.74E+02 2.67E+03 1.17E+03 3.00E+02 PASS 1.89E+03 2.59E+02 2.60E+03 1.18E+03 3.00E+02 PASS 1.81E+03 8.50E+01 2.04E+03 1.57E+03 3.00E+02 PASS An ISO 9001:2000 Certified Company 448 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #1 (dB) 1.30E+02 1.25E+02 1.20E+02 1.15E+02 1.10E+02 1.05E+02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.221. Plot of Large Signal Voltage Gain @ 5V #1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 449 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.221. Raw data for Large Signal Voltage Gain @ 5V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.26E+02 1.28E+02 1.30E+02 1.26E+02 1.29E+02 1.23E+02 1.26E+02 1.28E+02 1.26E+02 1.28E+02 1.28E+02 10 1.25E+02 1.25E+02 1.29E+02 1.26E+02 1.28E+02 1.27E+02 1.25E+02 1.27E+02 1.26E+02 1.29E+02 1.29E+02 20 1.25E+02 1.25E+02 1.28E+02 1.25E+02 1.27E+02 1.29E+02 1.26E+02 1.28E+02 1.26E+02 1.28E+02 1.28E+02 30 1.25E+02 1.26E+02 1.27E+02 1.25E+02 1.27E+02 1.27E+02 1.25E+02 1.27E+02 1.25E+02 1.27E+02 1.28E+02 50 1.23E+02 1.25E+02 1.26E+02 1.27E+02 1.28E+02 1.28E+02 1.24E+02 1.28E+02 1.25E+02 1.27E+02 1.29E+02 60 1.25E+02 1.27E+02 1.29E+02 1.26E+02 1.28E+02 1.27E+02 1.25E+02 1.27E+02 1.26E+02 1.29E+02 1.29E+02 70 1.24E+02 1.28E+02 1.29E+02 1.24E+02 1.28E+02 1.27E+02 1.25E+02 1.27E+02 1.25E+02 1.28E+02 1.28E+02 1.28E+02 1.81E+00 1.33E+02 1.23E+02 1.26E+02 1.52E+00 1.31E+02 1.22E+02 1.26E+02 1.44E+00 1.30E+02 1.22E+02 1.26E+02 1.17E+00 1.29E+02 1.23E+02 1.26E+02 1.69E+00 1.31E+02 1.21E+02 1.27E+02 1.65E+00 1.32E+02 1.23E+02 1.27E+02 2.34E+00 1.33E+02 1.20E+02 1.26E+02 2.09E+00 1.32E+02 1.20E+02 1.16E+02 PASS 1.27E+02 1.59E+00 1.31E+02 1.23E+02 1.10E+02 PASS 1.27E+02 1.29E+00 1.31E+02 1.24E+02 1.10E+02 PASS 1.26E+02 1.08E+00 1.29E+02 1.23E+02 1.10E+02 PASS 1.26E+02 1.75E+00 1.31E+02 1.22E+02 1.10E+02 PASS 1.27E+02 1.70E+00 1.32E+02 1.22E+02 1.10E+02 PASS 1.27E+02 1.24E+00 1.30E+02 1.23E+02 1.10E+02 PASS An ISO 9001:2000 Certified Company 450 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #2 (dB) 1.30E+02 1.25E+02 1.20E+02 1.15E+02 1.10E+02 1.05E+02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.222. Plot of Large Signal Voltage Gain @ 5V #2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 451 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.222. Raw data for Large Signal Voltage Gain @ 5V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.27E+02 1.25E+02 1.27E+02 1.25E+02 1.26E+02 1.27E+02 1.31E+02 1.28E+02 1.29E+02 1.27E+02 1.30E+02 10 1.26E+02 1.25E+02 1.25E+02 1.29E+02 1.25E+02 1.25E+02 1.27E+02 1.28E+02 1.29E+02 1.27E+02 1.28E+02 20 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.26E+02 1.27E+02 1.28E+02 1.28E+02 1.28E+02 1.27E+02 1.27E+02 30 1.26E+02 1.26E+02 1.26E+02 1.28E+02 1.25E+02 1.27E+02 1.26E+02 1.30E+02 1.28E+02 1.26E+02 1.29E+02 50 1.26E+02 1.26E+02 1.26E+02 1.26E+02 1.28E+02 1.26E+02 1.26E+02 1.29E+02 1.27E+02 1.23E+02 1.29E+02 60 1.25E+02 1.25E+02 1.25E+02 1.26E+02 1.26E+02 1.26E+02 1.30E+02 1.27E+02 1.27E+02 1.26E+02 1.29E+02 70 1.28E+02 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.24E+02 1.27E+02 1.26E+02 1.26E+02 1.26E+02 1.29E+02 1.26E+02 7.86E-01 1.28E+02 1.24E+02 1.26E+02 1.57E+00 1.30E+02 1.22E+02 1.25E+02 7.18E-01 1.27E+02 1.23E+02 1.26E+02 1.31E+00 1.30E+02 1.23E+02 1.26E+02 1.02E+00 1.29E+02 1.23E+02 1.25E+02 8.22E-01 1.27E+02 1.23E+02 1.26E+02 1.18E+00 1.29E+02 1.22E+02 1.28E+02 1.79E+00 1.33E+02 1.23E+02 1.16E+02 PASS 1.27E+02 1.39E+00 1.31E+02 1.23E+02 1.10E+02 PASS 1.28E+02 8.59E-01 1.30E+02 1.25E+02 1.10E+02 PASS 1.28E+02 1.82E+00 1.32E+02 1.23E+02 1.10E+02 PASS 1.26E+02 2.19E+00 1.32E+02 1.20E+02 1.10E+02 PASS 1.27E+02 1.51E+00 1.32E+02 1.23E+02 1.10E+02 PASS 1.26E+02 1.24E+00 1.29E+02 1.22E+02 1.10E+02 PASS An ISO 9001:2000 Certified Company 452 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #3 (dB) 1.30E+02 1.25E+02 1.20E+02 1.15E+02 1.10E+02 1.05E+02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.223. Plot of Large Signal Voltage Gain @ 5V #3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 453 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.223. Raw data for Large Signal Voltage Gain @ 5V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.29E+02 1.28E+02 1.27E+02 1.31E+02 1.27E+02 1.30E+02 1.27E+02 1.26E+02 1.27E+02 1.26E+02 1.27E+02 10 1.28E+02 1.29E+02 1.25E+02 1.27E+02 1.28E+02 1.29E+02 1.27E+02 1.26E+02 1.26E+02 1.26E+02 1.26E+02 20 1.27E+02 1.26E+02 1.25E+02 1.24E+02 1.29E+02 1.28E+02 1.27E+02 1.26E+02 1.26E+02 1.26E+02 1.26E+02 30 1.28E+02 1.27E+02 1.25E+02 1.26E+02 1.27E+02 1.27E+02 1.26E+02 1.28E+02 1.26E+02 1.25E+02 1.26E+02 50 1.27E+02 1.27E+02 1.25E+02 1.23E+02 1.27E+02 1.28E+02 1.26E+02 1.26E+02 1.25E+02 1.24E+02 1.26E+02 60 1.26E+02 1.26E+02 1.25E+02 1.25E+02 1.25E+02 1.28E+02 1.29E+02 1.27E+02 1.27E+02 1.26E+02 1.27E+02 70 1.28E+02 1.29E+02 1.25E+02 1.25E+02 1.27E+02 1.28E+02 1.27E+02 1.25E+02 1.27E+02 1.26E+02 1.26E+02 1.29E+02 1.50E+00 1.33E+02 1.24E+02 1.27E+02 1.52E+00 1.31E+02 1.23E+02 1.26E+02 1.78E+00 1.31E+02 1.21E+02 1.27E+02 1.24E+00 1.30E+02 1.23E+02 1.26E+02 1.61E+00 1.30E+02 1.21E+02 1.26E+02 5.41E-01 1.27E+02 1.24E+02 1.27E+02 1.67E+00 1.31E+02 1.22E+02 1.27E+02 1.49E+00 1.31E+02 1.23E+02 1.16E+02 PASS 1.27E+02 1.44E+00 1.31E+02 1.23E+02 1.10E+02 PASS 1.27E+02 6.30E-01 1.28E+02 1.25E+02 1.10E+02 PASS 1.26E+02 1.12E+00 1.29E+02 1.23E+02 1.10E+02 PASS 1.26E+02 1.57E+00 1.30E+02 1.22E+02 1.10E+02 PASS 1.28E+02 1.28E+00 1.31E+02 1.24E+02 1.10E+02 PASS 1.27E+02 1.04E+00 1.30E+02 1.24E+02 1.10E+02 PASS An ISO 9001:2000 Certified Company 454 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Large Signal Voltage Gain @ 5V #4 (dB) 1.30E+02 1.28E+02 1.26E+02 1.24E+02 1.22E+02 1.20E+02 1.18E+02 1.16E+02 1.14E+02 1.12E+02 1.10E+02 1.08E+02 0 10 20 30 40 50 24-hr 60 Anneal 168-hr 70 Anneal Total Dose (krad(Si)) Figure 5.224. Plot of Large Signal Voltage Gain @ 5V #4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 455 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.224. Raw data for Large Signal Voltage Gain @ 5V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @ 5V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.27E+02 1.25E+02 1.29E+02 1.27E+02 1.27E+02 1.27E+02 1.26E+02 1.28E+02 1.26E+02 1.26E+02 1.29E+02 10 1.26E+02 1.26E+02 1.28E+02 1.27E+02 1.26E+02 1.26E+02 1.24E+02 1.27E+02 1.27E+02 1.26E+02 1.28E+02 20 1.26E+02 1.26E+02 1.28E+02 1.27E+02 1.24E+02 1.29E+02 1.25E+02 1.26E+02 1.26E+02 1.26E+02 1.29E+02 30 1.26E+02 1.25E+02 1.28E+02 1.28E+02 1.25E+02 1.25E+02 1.25E+02 1.26E+02 1.25E+02 1.26E+02 1.31E+02 50 1.26E+02 1.24E+02 1.27E+02 1.26E+02 1.25E+02 1.27E+02 1.25E+02 1.26E+02 1.24E+02 1.26E+02 1.28E+02 60 1.27E+02 1.25E+02 1.27E+02 1.26E+02 1.25E+02 1.24E+02 1.27E+02 1.26E+02 1.26E+02 1.25E+02 1.26E+02 70 1.26E+02 1.25E+02 1.27E+02 1.27E+02 1.25E+02 1.25E+02 1.25E+02 1.25E+02 1.26E+02 1.25E+02 1.29E+02 1.27E+02 1.28E+00 1.31E+02 1.24E+02 1.26E+02 9.88E-01 1.29E+02 1.24E+02 1.26E+02 1.28E+00 1.30E+02 1.23E+02 1.26E+02 1.59E+00 1.31E+02 1.22E+02 1.26E+02 1.21E+00 1.29E+02 1.22E+02 1.26E+02 1.24E+00 1.29E+02 1.23E+02 1.26E+02 8.67E-01 1.28E+02 1.24E+02 1.27E+02 5.48E-01 1.28E+02 1.25E+02 1.16E+02 PASS 1.26E+02 1.17E+00 1.29E+02 1.23E+02 1.10E+02 PASS 1.26E+02 1.55E+00 1.30E+02 1.22E+02 1.10E+02 PASS 1.26E+02 4.34E-01 1.27E+02 1.25E+02 1.10E+02 PASS 1.26E+02 1.26E+00 1.29E+02 1.22E+02 1.10E+02 PASS 1.25E+02 1.22E+00 1.29E+02 1.22E+02 1.10E+02 PASS 1.25E+02 3.98E-01 1.26E+02 1.24E+02 1.10E+02 PASS An ISO 9001:2000 Certified Company 456 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ 5V #1 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.225. Plot of Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 457 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.225. Raw data for Common Mode Rejection Ratio @ 5V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 5V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.33E+01 1.06E+02 8.54E+01 9.07E+01 1.08E+02 8.74E+01 8.73E+01 9.38E+01 8.43E+01 9.48E+01 9.97E+01 10 8.35E+01 1.05E+02 8.54E+01 9.07E+01 1.05E+02 8.73E+01 8.73E+01 9.44E+01 8.42E+01 9.57E+01 9.93E+01 20 8.36E+01 1.04E+02 8.54E+01 9.07E+01 1.04E+02 8.72E+01 8.72E+01 9.46E+01 8.41E+01 9.59E+01 9.94E+01 30 8.37E+01 1.04E+02 8.53E+01 9.08E+01 1.05E+02 8.72E+01 8.72E+01 9.46E+01 8.41E+01 9.59E+01 9.95E+01 50 8.37E+01 1.04E+02 8.52E+01 9.08E+01 1.06E+02 8.71E+01 8.72E+01 9.48E+01 8.40E+01 9.61E+01 9.96E+01 60 8.37E+01 1.04E+02 8.52E+01 9.07E+01 1.06E+02 8.71E+01 8.73E+01 9.46E+01 8.41E+01 9.60E+01 9.96E+01 70 8.41E+01 1.05E+02 8.53E+01 9.15E+01 1.03E+02 8.79E+01 8.71E+01 9.50E+01 8.41E+01 9.97E+01 9.96E+01 9.48E+01 1.17E+01 1.27E+02 6.27E+01 9.39E+01 1.04E+01 1.22E+02 6.53E+01 9.36E+01 9.95E+00 1.21E+02 6.63E+01 9.39E+01 1.04E+01 1.22E+02 6.54E+01 9.38E+01 1.03E+01 1.22E+02 6.56E+01 9.39E+01 1.04E+01 1.22E+02 6.54E+01 9.37E+01 9.72E+00 1.20E+02 6.71E+01 8.95E+01 4.55E+00 1.02E+02 7.70E+01 7.60E+01 FAIL 8.98E+01 5.01E+00 1.04E+02 7.61E+01 7.00E+01 FAIL 8.98E+01 5.13E+00 1.04E+02 7.57E+01 7.00E+01 FAIL 8.98E+01 5.16E+00 1.04E+02 7.56E+01 7.00E+01 FAIL 8.99E+01 5.30E+00 1.04E+02 7.53E+01 7.00E+01 FAIL 8.98E+01 5.20E+00 1.04E+02 7.55E+01 7.00E+01 FAIL 9.07E+01 6.42E+00 1.08E+02 7.31E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 458 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ 5V #2 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.226. Plot of Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 459 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.226. Raw data for Common Mode Rejection Ratio @ 5V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 5V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.95E+01 8.89E+01 8.96E+01 8.19E+01 8.60E+01 8.39E+01 8.91E+01 1.32E+02 8.89E+01 9.00E+01 9.63E+01 10 1.00E+02 8.88E+01 8.97E+01 8.21E+01 8.60E+01 8.37E+01 8.88E+01 1.19E+02 8.90E+01 8.99E+01 9.57E+01 20 1.00E+02 8.89E+01 8.97E+01 8.22E+01 8.59E+01 8.37E+01 8.87E+01 1.18E+02 8.89E+01 8.99E+01 9.64E+01 30 1.01E+02 8.88E+01 8.97E+01 8.22E+01 8.59E+01 8.37E+01 8.86E+01 1.16E+02 8.89E+01 8.98E+01 9.59E+01 50 1.02E+02 8.85E+01 8.97E+01 8.23E+01 8.59E+01 8.36E+01 8.84E+01 1.15E+02 8.86E+01 8.96E+01 9.59E+01 60 1.02E+02 8.85E+01 8.97E+01 8.23E+01 8.60E+01 8.37E+01 8.84E+01 1.16E+02 8.86E+01 8.97E+01 9.63E+01 70 9.84E+01 8.96E+01 8.91E+01 8.22E+01 8.66E+01 8.39E+01 8.86E+01 1.24E+02 8.90E+01 9.07E+01 9.64E+01 8.92E+01 6.49E+00 1.07E+02 7.14E+01 8.94E+01 6.85E+00 1.08E+02 7.06E+01 8.94E+01 6.85E+00 1.08E+02 7.06E+01 8.95E+01 7.03E+00 1.09E+02 7.02E+01 8.97E+01 7.60E+00 1.11E+02 6.89E+01 8.97E+01 7.36E+00 1.10E+02 6.95E+01 8.92E+01 5.93E+00 1.05E+02 7.29E+01 9.67E+01 1.96E+01 1.50E+02 4.29E+01 7.60E+01 FAIL 9.41E+01 1.41E+01 1.33E+02 5.53E+01 7.00E+01 FAIL 9.38E+01 1.37E+01 1.31E+02 5.63E+01 7.00E+01 FAIL 9.33E+01 1.27E+01 1.28E+02 5.84E+01 7.00E+01 FAIL 9.31E+01 1.26E+01 1.28E+02 5.85E+01 7.00E+01 FAIL 9.33E+01 1.29E+01 1.29E+02 5.79E+01 7.00E+01 FAIL 9.53E+01 1.63E+01 1.40E+02 5.05E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 460 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ 5V #3 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.227. Plot of Common Mode Rejection Ratio @ 5V #3 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 461 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.227. Raw data for Common Mode Rejection Ratio @ 5V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 5V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 9.21E+01 8.40E+01 8.28E+01 8.47E+01 9.87E+01 9.15E+01 9.63E+01 8.16E+01 9.07E+01 8.49E+01 8.28E+01 10 9.14E+01 8.42E+01 8.29E+01 8.46E+01 9.83E+01 9.12E+01 9.59E+01 8.15E+01 9.06E+01 8.49E+01 8.29E+01 20 9.12E+01 8.43E+01 8.31E+01 8.46E+01 9.81E+01 9.10E+01 9.56E+01 8.16E+01 9.05E+01 8.50E+01 8.28E+01 30 9.10E+01 8.43E+01 8.31E+01 8.46E+01 9.79E+01 9.09E+01 9.55E+01 8.15E+01 9.05E+01 8.49E+01 8.28E+01 50 9.06E+01 8.44E+01 8.34E+01 8.44E+01 9.72E+01 9.07E+01 9.55E+01 8.16E+01 9.05E+01 8.49E+01 8.29E+01 60 9.06E+01 8.45E+01 8.33E+01 8.45E+01 9.74E+01 9.08E+01 9.55E+01 8.16E+01 9.04E+01 8.49E+01 8.28E+01 70 9.06E+01 8.45E+01 8.31E+01 8.43E+01 9.66E+01 9.18E+01 9.57E+01 8.16E+01 9.05E+01 8.51E+01 8.28E+01 8.85E+01 6.77E+00 1.07E+02 6.99E+01 8.83E+01 6.51E+00 1.06E+02 7.05E+01 8.83E+01 6.35E+00 1.06E+02 7.08E+01 8.82E+01 6.25E+00 1.05E+02 7.11E+01 8.80E+01 5.89E+00 1.04E+02 7.19E+01 8.81E+01 5.95E+00 1.04E+02 7.17E+01 8.78E+01 5.71E+00 1.03E+02 7.21E+01 8.90E+01 5.76E+00 1.05E+02 7.32E+01 7.60E+01 FAIL 8.88E+01 5.63E+00 1.04E+02 7.34E+01 7.00E+01 PASS 8.87E+01 5.51E+00 1.04E+02 7.36E+01 7.00E+01 PASS 8.87E+01 5.47E+00 1.04E+02 7.37E+01 7.00E+01 PASS 8.87E+01 5.44E+00 1.04E+02 7.37E+01 7.00E+01 PASS 8.87E+01 5.45E+00 1.04E+02 7.37E+01 7.00E+01 PASS 8.89E+01 5.60E+00 1.04E+02 7.36E+01 7.00E+01 PASS An ISO 9001:2000 Certified Company 462 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio @ 5V #4 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.228. Plot of Common Mode Rejection Ratio @ 5V #4 (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 463 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.228. Raw data for Common Mode Rejection Ratio @ 5V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @ 5V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.03E+02 9.30E+01 8.85E+01 9.27E+01 1.12E+02 8.89E+01 8.53E+01 8.31E+01 8.45E+01 9.21E+01 9.48E+01 10 1.02E+02 9.30E+01 8.85E+01 9.24E+01 1.19E+02 8.88E+01 8.53E+01 8.29E+01 8.45E+01 9.17E+01 9.47E+01 20 1.01E+02 9.28E+01 8.86E+01 9.23E+01 1.20E+02 8.87E+01 8.53E+01 8.28E+01 8.44E+01 9.16E+01 9.47E+01 30 1.00E+02 9.28E+01 8.85E+01 9.21E+01 1.21E+02 8.87E+01 8.53E+01 8.28E+01 8.44E+01 9.16E+01 9.49E+01 50 9.99E+01 9.28E+01 8.85E+01 9.19E+01 1.45E+02 8.85E+01 8.53E+01 8.27E+01 8.43E+01 9.15E+01 9.49E+01 60 9.99E+01 9.28E+01 8.85E+01 9.19E+01 1.34E+02 8.85E+01 8.53E+01 8.27E+01 8.43E+01 9.15E+01 9.49E+01 70 1.00E+02 9.27E+01 8.77E+01 9.25E+01 1.30E+02 8.87E+01 8.48E+01 8.26E+01 8.42E+01 9.21E+01 9.49E+01 9.77E+01 9.36E+00 1.23E+02 7.21E+01 9.88E+01 1.20E+01 1.32E+02 6.59E+01 9.90E+01 1.28E+01 1.34E+02 6.40E+01 9.90E+01 1.30E+01 1.35E+02 6.32E+01 1.04E+02 2.37E+01 1.69E+02 3.88E+01 1.02E+02 1.89E+01 1.53E+02 4.98E+01 1.01E+02 1.72E+01 1.48E+02 5.34E+01 8.68E+01 3.65E+00 9.68E+01 7.68E+01 7.60E+01 FAIL 8.66E+01 3.57E+00 9.64E+01 7.69E+01 7.00E+01 FAIL 8.66E+01 3.55E+00 9.63E+01 7.68E+01 7.00E+01 FAIL 8.65E+01 3.55E+00 9.63E+01 7.68E+01 7.00E+01 FAIL 8.65E+01 3.54E+00 9.62E+01 7.68E+01 7.00E+01 FAIL 8.65E+01 3.53E+00 9.61E+01 7.68E+01 7.00E+01 FAIL 8.65E+01 3.87E+00 9.71E+01 7.59E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 464 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.10E+02 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.229. Plot of Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 465 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.229. Raw data for Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.42E+01 9.52E+01 9.59E+01 1.04E+02 1.04E+02 1.03E+02 9.89E+01 8.09E+01 1.16E+02 8.73E+01 1.02E+02 10 8.47E+01 9.56E+01 9.56E+01 1.05E+02 1.04E+02 1.03E+02 9.89E+01 8.09E+01 1.16E+02 8.75E+01 1.03E+02 20 8.49E+01 9.55E+01 9.56E+01 1.06E+02 1.03E+02 1.03E+02 9.93E+01 8.09E+01 1.14E+02 8.75E+01 1.02E+02 30 8.50E+01 9.55E+01 9.53E+01 1.08E+02 1.04E+02 1.03E+02 9.92E+01 8.08E+01 1.14E+02 8.75E+01 1.03E+02 50 8.52E+01 9.57E+01 9.51E+01 1.09E+02 1.06E+02 1.03E+02 9.91E+01 8.08E+01 1.15E+02 8.75E+01 1.03E+02 60 8.52E+01 9.56E+01 9.52E+01 1.09E+02 1.05E+02 1.04E+02 9.89E+01 8.07E+01 1.16E+02 8.74E+01 1.03E+02 70 8.56E+01 9.51E+01 9.74E+01 1.11E+02 1.03E+02 1.08E+02 9.75E+01 8.08E+01 1.23E+02 8.91E+01 1.02E+02 9.67E+01 8.20E+00 1.19E+02 7.42E+01 9.70E+01 8.19E+00 1.19E+02 7.45E+01 9.70E+01 8.21E+00 1.19E+02 7.45E+01 9.75E+01 8.79E+00 1.22E+02 7.34E+01 9.81E+01 9.37E+00 1.24E+02 7.24E+01 9.81E+01 9.33E+00 1.24E+02 7.25E+01 9.84E+01 9.43E+00 1.24E+02 7.26E+01 9.74E+01 1.39E+01 1.36E+02 5.93E+01 7.50E+01 FAIL 9.72E+01 1.36E+01 1.35E+02 5.99E+01 7.00E+01 FAIL 9.70E+01 1.32E+01 1.33E+02 6.09E+01 7.00E+01 FAIL 9.69E+01 1.31E+01 1.33E+02 6.11E+01 7.00E+01 FAIL 9.72E+01 1.36E+01 1.34E+02 6.00E+01 7.00E+01 FAIL 9.73E+01 1.38E+01 1.35E+02 5.95E+01 7.00E+01 FAIL 9.97E+01 1.64E+01 1.45E+02 5.47E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 466 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.230. Plot of Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 467 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.230. Raw data for Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 8.90E+01 9.14E+01 8.81E+01 9.32E+01 8.83E+01 8.86E+01 9.41E+01 8.17E+01 1.03E+02 9.20E+01 8.48E+01 10 8.88E+01 9.19E+01 8.83E+01 9.41E+01 8.83E+01 8.85E+01 9.39E+01 8.17E+01 1.04E+02 9.22E+01 8.51E+01 20 8.86E+01 9.21E+01 8.85E+01 9.44E+01 8.84E+01 8.86E+01 9.38E+01 8.17E+01 1.04E+02 9.23E+01 8.49E+01 30 8.86E+01 9.22E+01 8.86E+01 9.47E+01 8.84E+01 8.86E+01 9.38E+01 8.17E+01 1.04E+02 9.23E+01 8.50E+01 50 8.86E+01 9.29E+01 8.91E+01 9.54E+01 8.87E+01 8.87E+01 9.34E+01 8.18E+01 1.03E+02 9.26E+01 8.50E+01 60 8.85E+01 9.30E+01 8.90E+01 9.54E+01 8.87E+01 8.87E+01 9.34E+01 8.17E+01 1.03E+02 9.24E+01 8.49E+01 70 8.76E+01 9.15E+01 8.90E+01 9.56E+01 8.99E+01 8.84E+01 9.37E+01 8.15E+01 1.05E+02 9.15E+01 8.49E+01 9.00E+01 2.20E+00 9.61E+01 8.40E+01 9.03E+01 2.60E+00 9.74E+01 8.32E+01 9.04E+01 2.73E+00 9.79E+01 8.29E+01 9.05E+01 2.83E+00 9.83E+01 8.28E+01 9.10E+01 3.07E+00 9.94E+01 8.25E+01 9.09E+01 3.10E+00 9.94E+01 8.24E+01 9.07E+01 3.07E+00 9.92E+01 8.23E+01 9.19E+01 7.91E+00 1.14E+02 7.02E+01 7.50E+01 FAIL 9.21E+01 8.33E+00 1.15E+02 6.93E+01 7.00E+01 FAIL 9.21E+01 8.20E+00 1.15E+02 6.96E+01 7.00E+01 FAIL 9.21E+01 8.23E+00 1.15E+02 6.96E+01 7.00E+01 FAIL 9.19E+01 7.70E+00 1.13E+02 7.08E+01 7.00E+01 PASS 9.19E+01 7.81E+00 1.13E+02 7.05E+01 7.00E+01 PASS 9.21E+01 8.76E+00 1.16E+02 6.81E+01 7.00E+01 FAIL An ISO 9001:2000 Certified Company 468 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.231. Plot of Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 469 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.231. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.15E+02 1.00E+02 1.02E+02 1.11E+02 1.05E+02 1.12E+02 1.13E+02 1.15E+02 1.12E+02 1.20E+02 1.11E+02 10 1.15E+02 1.01E+02 1.03E+02 1.11E+02 1.05E+02 1.12E+02 1.13E+02 1.15E+02 1.12E+02 1.21E+02 1.11E+02 20 1.15E+02 1.01E+02 1.02E+02 1.11E+02 1.04E+02 1.09E+02 1.11E+02 1.12E+02 1.13E+02 1.14E+02 1.09E+02 30 1.13E+02 1.01E+02 1.02E+02 1.09E+02 1.04E+02 1.09E+02 1.11E+02 1.12E+02 1.13E+02 1.13E+02 1.09E+02 50 1.74E+01 1.72E+01 1.74E+01 1.69E+01 1.73E+01 1.09E+02 1.11E+02 1.11E+02 1.13E+02 1.13E+02 1.09E+02 60 1.75E+01 1.73E+01 1.74E+01 1.69E+01 1.72E+01 1.09E+02 1.11E+02 1.12E+02 1.13E+02 1.14E+02 1.09E+02 70 1.16E+02 1.01E+02 1.02E+02 1.12E+02 1.04E+02 1.09E+02 1.11E+02 1.12E+02 1.13E+02 1.14E+02 1.09E+02 1.07E+02 6.18E+00 1.24E+02 8.98E+01 1.07E+02 6.04E+00 1.23E+02 9.02E+01 1.07E+02 6.20E+00 1.24E+02 8.95E+01 1.06E+02 5.39E+00 1.21E+02 9.10E+01 1.72E+01 1.80E-01 1.77E+01 1.68E+01 1.73E+01 2.19E-01 1.79E+01 1.67E+01 1.07E+02 6.66E+00 1.25E+02 8.86E+01 1.14E+02 3.26E+00 1.23E+02 1.05E+02 8.80E+01 PASS 1.15E+02 3.52E+00 1.24E+02 1.05E+02 8.80E+01 PASS 1.12E+02 1.59E+00 1.16E+02 1.07E+02 8.80E+01 PASS 1.12E+02 1.55E+00 1.16E+02 1.07E+02 8.80E+01 PASS 1.12E+02 1.67E+00 1.16E+02 1.07E+02 8.80E+01 FAIL 1.12E+02 1.65E+00 1.16E+02 1.07E+02 8.80E+01 FAIL 1.12E+02 1.56E+00 1.16E+02 1.07E+02 8.80E+01 PASS An ISO 9001:2000 Certified Company 470 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 -2.00E+01 -4.00E+01 -6.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.232. Plot of Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 471 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.232. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.09E+02 1.08E+02 1.11E+02 1.04E+02 1.03E+02 9.96E+01 1.28E+02 1.08E+02 1.07E+02 1.02E+02 1.06E+02 10 1.09E+02 1.08E+02 1.12E+02 1.04E+02 1.03E+02 9.97E+01 1.33E+02 1.08E+02 1.07E+02 1.03E+02 1.06E+02 20 1.10E+02 1.07E+02 1.11E+02 1.04E+02 1.03E+02 9.97E+01 1.18E+02 1.06E+02 1.05E+02 1.03E+02 1.05E+02 30 1.08E+02 1.06E+02 1.09E+02 1.03E+02 1.03E+02 9.97E+01 1.17E+02 1.06E+02 1.05E+02 1.03E+02 1.04E+02 50 7.95E+01 1.70E+01 7.85E+01 1.70E+01 7.86E+01 9.96E+01 1.19E+02 1.07E+02 1.05E+02 1.03E+02 1.04E+02 60 7.95E+01 1.71E+01 7.85E+01 1.69E+01 7.86E+01 9.96E+01 1.18E+02 1.06E+02 1.05E+02 1.03E+02 1.04E+02 70 1.10E+02 1.08E+02 1.11E+02 1.04E+02 1.04E+02 9.96E+01 1.18E+02 1.06E+02 1.05E+02 1.03E+02 1.04E+02 1.07E+02 3.48E+00 1.17E+02 9.75E+01 1.07E+02 3.63E+00 1.17E+02 9.72E+01 1.07E+02 3.40E+00 1.16E+02 9.77E+01 1.06E+02 3.04E+00 1.14E+02 9.75E+01 5.41E+01 3.39E+01 1.47E+02 -3.88E+01 5.41E+01 3.39E+01 1.47E+02 -3.88E+01 1.07E+02 3.41E+00 1.17E+02 9.78E+01 1.09E+02 1.10E+01 1.39E+02 7.89E+01 8.80E+01 FAIL 1.10E+02 1.32E+01 1.46E+02 7.40E+01 8.80E+01 FAIL 1.06E+02 6.81E+00 1.25E+02 8.77E+01 8.80E+01 FAIL 1.06E+02 6.66E+00 1.25E+02 8.80E+01 8.80E+01 PASS 1.07E+02 7.20E+00 1.26E+02 8.68E+01 8.80E+01 FAIL 1.07E+02 7.14E+00 1.26E+02 8.70E+01 8.80E+01 FAIL 1.07E+02 7.14E+00 1.26E+02 8.70E+01 8.80E+01 FAIL An ISO 9001:2000 Certified Company 472 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.233. Plot of Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 473 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.233. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.04E+02 1.02E+02 1.14E+02 1.03E+02 1.07E+02 1.07E+02 1.32E+02 1.06E+02 1.06E+02 1.11E+02 1.06E+02 10 1.04E+02 1.02E+02 1.13E+02 1.03E+02 1.07E+02 1.07E+02 1.39E+02 1.06E+02 1.06E+02 1.11E+02 1.07E+02 20 1.03E+02 1.01E+02 1.12E+02 1.03E+02 1.06E+02 1.07E+02 1.18E+02 1.05E+02 1.06E+02 1.10E+02 1.06E+02 30 1.03E+02 1.01E+02 1.11E+02 1.03E+02 1.06E+02 1.07E+02 1.19E+02 1.05E+02 1.06E+02 1.10E+02 1.06E+02 50 1.69E+01 1.72E+01 1.71E+01 1.70E+01 1.69E+01 1.07E+02 1.21E+02 1.05E+02 1.06E+02 1.10E+02 1.06E+02 60 1.69E+01 1.72E+01 1.70E+01 1.70E+01 1.68E+01 1.07E+02 1.19E+02 1.05E+02 1.06E+02 1.10E+02 1.06E+02 70 1.03E+02 1.01E+02 1.13E+02 1.04E+02 1.06E+02 1.07E+02 1.20E+02 1.05E+02 1.06E+02 1.10E+02 1.06E+02 1.06E+02 5.03E+00 1.20E+02 9.23E+01 1.06E+02 4.54E+00 1.18E+02 9.35E+01 1.05E+02 4.24E+00 1.17E+02 9.36E+01 1.05E+02 3.70E+00 1.15E+02 9.46E+01 1.70E+01 1.47E-01 1.74E+01 1.66E+01 1.70E+01 1.23E-01 1.73E+01 1.66E+01 1.05E+02 4.37E+00 1.17E+02 9.34E+01 1.12E+02 1.13E+01 1.43E+02 8.15E+01 8.80E+01 FAIL 1.14E+02 1.40E+01 1.52E+02 7.54E+01 8.80E+01 FAIL 1.09E+02 5.46E+00 1.24E+02 9.42E+01 8.80E+01 PASS 1.09E+02 5.83E+00 1.25E+02 9.35E+01 8.80E+01 PASS 1.10E+02 6.34E+00 1.27E+02 9.24E+01 8.80E+01 FAIL 1.09E+02 5.62E+00 1.25E+02 9.40E+01 8.80E+01 FAIL 1.10E+02 6.08E+00 1.26E+02 9.30E+01 8.80E+01 PASS An ISO 9001:2000 Certified Company 474 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 -2.00E+01 -4.00E+01 -6.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.234. Plot of Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 475 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.234. Raw data for Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.49E+02 1.06E+02 1.06E+02 1.34E+02 1.18E+02 1.02E+02 1.05E+02 1.12E+02 1.04E+02 1.01E+02 1.11E+02 10 1.33E+02 1.06E+02 1.06E+02 1.31E+02 1.18E+02 1.02E+02 1.05E+02 1.12E+02 1.04E+02 1.01E+02 1.11E+02 20 1.39E+02 1.06E+02 1.05E+02 1.26E+02 1.15E+02 1.02E+02 1.04E+02 1.10E+02 1.04E+02 1.01E+02 1.09E+02 30 1.28E+02 1.05E+02 1.05E+02 1.26E+02 1.14E+02 1.02E+02 1.04E+02 1.10E+02 1.04E+02 1.01E+02 1.09E+02 50 1.74E+01 7.89E+01 1.70E+01 1.68E+01 1.71E+01 1.02E+02 1.04E+02 1.10E+02 1.04E+02 1.01E+02 1.09E+02 60 1.75E+01 7.90E+01 1.71E+01 1.68E+01 1.71E+01 1.02E+02 1.04E+02 1.10E+02 1.04E+02 1.01E+02 1.09E+02 70 1.42E+02 1.06E+02 1.05E+02 1.27E+02 1.16E+02 1.02E+02 1.04E+02 1.10E+02 1.04E+02 1.01E+02 1.09E+02 1.23E+02 1.88E+01 1.74E+02 7.10E+01 1.19E+02 1.31E+01 1.55E+02 8.31E+01 1.18E+02 1.43E+01 1.57E+02 7.91E+01 1.16E+02 1.09E+01 1.45E+02 8.58E+01 2.95E+01 2.77E+01 1.05E+02 -4.64E+01 2.95E+01 2.77E+01 1.05E+02 -4.64E+01 1.19E+02 1.57E+01 1.62E+02 7.61E+01 1.05E+02 4.19E+00 1.16E+02 9.31E+01 8.80E+01 FAIL 1.05E+02 4.35E+00 1.17E+02 9.29E+01 8.80E+01 FAIL 1.04E+02 3.66E+00 1.14E+02 9.41E+01 8.80E+01 FAIL 1.04E+02 3.71E+00 1.14E+02 9.40E+01 8.80E+01 FAIL 1.04E+02 3.68E+00 1.14E+02 9.41E+01 8.80E+01 FAIL 1.04E+02 3.66E+00 1.14E+02 9.41E+01 8.80E+01 FAIL 1.04E+02 3.71E+00 1.14E+02 9.40E+01 8.80E+01 FAIL An ISO 9001:2000 Certified Company 476 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio Matching 1-4 @ 2.2V12V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 -2.00E+01 -4.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.235. Plot of Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 477 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.235. Raw data for Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.15E+02 1.07E+02 1.11E+02 1.10E+02 1.07E+02 1.05E+02 1.09E+02 1.22E+02 1.08E+02 1.02E+02 1.46E+02 10 1.14E+02 1.07E+02 1.11E+02 1.10E+02 1.07E+02 1.05E+02 1.09E+02 1.25E+02 1.08E+02 1.02E+02 1.50E+02 20 1.16E+02 1.08E+02 1.12E+02 1.13E+02 1.06E+02 1.07E+02 1.09E+02 1.27E+02 1.08E+02 1.03E+02 1.60E+02 30 1.15E+02 1.08E+02 1.12E+02 1.10E+02 1.07E+02 1.07E+02 1.09E+02 1.28E+02 1.08E+02 1.03E+02 1.79E+02 50 7.95E+01 1.73E+01 4.60E+01 5.42E+01 5.02E+01 1.07E+02 1.09E+02 1.39E+02 1.08E+02 1.03E+02 1.54E+02 60 9.94E+01 1.73E+01 4.54E+01 5.64E+01 5.15E+01 1.07E+02 1.09E+02 1.25E+02 1.08E+02 1.03E+02 1.46E+02 70 1.16E+02 1.08E+02 1.12E+02 1.14E+02 1.06E+02 1.07E+02 1.09E+02 1.27E+02 1.08E+02 1.03E+02 1.62E+02 1.10E+02 3.28E+00 1.19E+02 1.01E+02 1.10E+02 2.91E+00 1.18E+02 1.02E+02 1.11E+02 3.76E+00 1.21E+02 1.01E+02 1.11E+02 3.25E+00 1.20E+02 1.02E+02 4.94E+01 2.22E+01 1.10E+02 -1.15E+01 5.40E+01 2.96E+01 1.35E+02 -2.70E+01 1.11E+02 4.11E+00 1.23E+02 1.00E+02 1.09E+02 7.79E+00 1.31E+02 8.79E+01 8.20E+01 PASS 1.10E+02 8.70E+00 1.34E+02 8.59E+01 8.20E+01 PASS 1.11E+02 9.41E+00 1.37E+02 8.49E+01 8.20E+01 PASS 1.11E+02 9.54E+00 1.37E+02 8.47E+01 8.20E+01 PASS 1.13E+02 1.47E+01 1.53E+02 7.29E+01 8.20E+01 FAIL 1.10E+02 8.69E+00 1.34E+02 8.65E+01 8.20E+01 FAIL 1.11E+02 9.32E+00 1.36E+02 8.51E+01 8.20E+01 PASS An ISO 9001:2000 Certified Company 478 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Power Supply Rejection Ratio Matching 2-3 @ 2.2V12V (dB) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 -2.00E+01 -4.00E+01 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.236. Plot of Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB) versus total dose. The data show a significant change with radiation causing a failure at the 50krad(Si) dose level. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 479 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.236. Raw data for Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 1.11E+02 1.08E+02 1.22E+02 1.27E+02 1.12E+02 1.04E+02 1.35E+02 1.17E+02 1.27E+02 1.06E+02 1.35E+02 10 1.11E+02 1.08E+02 1.27E+02 1.30E+02 1.12E+02 1.04E+02 1.39E+02 1.18E+02 1.28E+02 1.06E+02 1.26E+02 20 1.09E+02 1.07E+02 1.27E+02 1.31E+02 1.15E+02 1.05E+02 1.40E+02 1.22E+02 1.27E+02 1.08E+02 1.22E+02 30 1.11E+02 1.09E+02 1.26E+02 1.29E+02 1.13E+02 1.05E+02 1.31E+02 1.24E+02 1.25E+02 1.08E+02 1.22E+02 50 1.69E+01 4.96E+01 1.71E+01 6.20E+01 1.69E+01 1.05E+02 1.32E+02 1.23E+02 1.26E+02 1.08E+02 1.18E+02 60 1.69E+01 5.67E+01 1.70E+01 6.33E+01 1.68E+01 1.05E+02 1.46E+02 1.23E+02 1.28E+02 1.08E+02 1.18E+02 70 1.09E+02 1.07E+02 1.27E+02 1.35E+02 1.17E+02 1.05E+02 1.34E+02 1.23E+02 1.26E+02 1.08E+02 1.21E+02 1.16E+02 8.27E+00 1.39E+02 9.34E+01 1.17E+02 1.00E+01 1.45E+02 8.99E+01 1.18E+02 1.07E+01 1.47E+02 8.86E+01 1.18E+02 9.52E+00 1.44E+02 9.14E+01 3.25E+01 2.17E+01 9.21E+01 -2.71E+01 3.42E+01 2.37E+01 9.92E+01 -3.09E+01 1.19E+02 1.18E+01 1.51E+02 8.65E+01 1.18E+02 1.32E+01 1.54E+02 8.21E+01 8.20E+01 PASS 1.19E+02 1.46E+01 1.59E+02 7.91E+01 8.20E+01 FAIL 1.20E+02 1.42E+01 1.59E+02 8.13E+01 8.20E+01 FAIL 1.19E+02 1.14E+01 1.50E+02 8.73E+01 8.20E+01 PASS 1.19E+02 1.19E+01 1.51E+02 8.62E+01 8.20E+01 FAIL 1.22E+02 1.66E+01 1.68E+02 7.65E+01 8.20E+01 FAIL 1.19E+02 1.24E+01 1.53E+02 8.52E+01 8.20E+01 PASS An ISO 9001:2000 Certified Company 480 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.237. Plot of Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 481 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.237. Raw data for Output Voltage Swing High IL= 0mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.25E-03 3.98E-03 3.91E-03 3.91E-03 3.97E-03 4.17E-03 3.93E-03 4.08E-03 3.83E-03 3.96E-03 4.10E-03 10 4.25E-03 3.95E-03 3.85E-03 3.95E-03 4.03E-03 4.24E-03 4.04E-03 4.09E-03 3.87E-03 3.88E-03 4.17E-03 20 4.27E-03 4.00E-03 3.93E-03 4.05E-03 4.13E-03 4.08E-03 4.15E-03 4.15E-03 4.11E-03 4.06E-03 4.22E-03 30 4.29E-03 4.09E-03 4.02E-03 3.90E-03 3.94E-03 4.21E-03 4.26E-03 4.14E-03 3.97E-03 4.19E-03 4.11E-03 50 4.37E-03 4.12E-03 3.88E-03 3.99E-03 4.05E-03 4.32E-03 4.36E-03 4.27E-03 4.14E-03 4.24E-03 4.14E-03 60 4.19E-03 4.16E-03 4.02E-03 4.01E-03 4.11E-03 4.16E-03 4.22E-03 4.19E-03 4.21E-03 4.12E-03 4.19E-03 70 4.07E-03 4.02E-03 3.92E-03 3.88E-03 4.03E-03 4.05E-03 4.29E-03 4.08E-03 3.93E-03 4.13E-03 4.18E-03 4.00E-03 1.41E-04 4.39E-03 3.62E-03 4.01E-03 1.51E-04 4.42E-03 3.59E-03 4.08E-03 1.31E-04 4.43E-03 3.72E-03 4.05E-03 1.54E-04 4.47E-03 3.63E-03 4.08E-03 1.83E-04 4.59E-03 3.58E-03 4.10E-03 8.11E-05 4.32E-03 3.88E-03 3.98E-03 8.02E-05 4.20E-03 3.76E-03 3.99E-03 1.33E-04 4.36E-03 3.63E-03 1.00E-02 PASS 4.02E-03 1.55E-04 4.45E-03 3.60E-03 2.00E-02 PASS 4.11E-03 4.06E-05 4.22E-03 4.00E-03 2.00E-02 PASS 4.15E-03 1.11E-04 4.46E-03 3.85E-03 2.00E-02 PASS 4.27E-03 8.41E-05 4.50E-03 4.04E-03 2.00E-02 PASS 4.18E-03 4.06E-05 4.29E-03 4.07E-03 2.00E-02 PASS 4.10E-03 1.31E-04 4.46E-03 3.74E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 482 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.238. Plot of Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 483 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.238. Raw data for Output Voltage Swing High IL= 0mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.03E-03 4.22E-03 3.91E-03 3.97E-03 3.88E-03 4.02E-03 3.91E-03 4.00E-03 3.83E-03 4.05E-03 3.91E-03 10 3.95E-03 4.10E-03 3.85E-03 3.93E-03 4.00E-03 3.95E-03 4.04E-03 4.12E-03 3.85E-03 4.10E-03 4.09E-03 20 4.11E-03 4.05E-03 4.00E-03 4.01E-03 4.11E-03 4.10E-03 4.18E-03 4.08E-03 4.00E-03 4.06E-03 3.93E-03 30 4.02E-03 4.16E-03 3.95E-03 4.19E-03 4.04E-03 4.12E-03 4.27E-03 4.24E-03 4.11E-03 4.22E-03 3.99E-03 50 4.02E-03 4.19E-03 4.12E-03 4.07E-03 4.12E-03 3.97E-03 4.24E-03 4.17E-03 4.20E-03 4.24E-03 4.04E-03 60 4.31E-03 4.19E-03 4.07E-03 4.17E-03 4.06E-03 4.16E-03 4.27E-03 4.26E-03 4.16E-03 4.26E-03 4.09E-03 70 3.98E-03 4.08E-03 3.73E-03 3.97E-03 3.85E-03 4.07E-03 4.24E-03 4.22E-03 4.02E-03 4.25E-03 4.03E-03 4.00E-03 1.35E-04 4.37E-03 3.63E-03 3.97E-03 9.24E-05 4.22E-03 3.71E-03 4.06E-03 5.27E-05 4.20E-03 3.91E-03 4.07E-03 1.00E-04 4.35E-03 3.80E-03 4.10E-03 6.35E-05 4.28E-03 3.93E-03 4.16E-03 1.02E-04 4.44E-03 3.88E-03 3.92E-03 1.35E-04 4.29E-03 3.55E-03 3.96E-03 9.04E-05 4.21E-03 3.71E-03 1.00E-02 PASS 4.01E-03 1.12E-04 4.32E-03 3.70E-03 2.00E-02 PASS 4.08E-03 6.54E-05 4.26E-03 3.90E-03 2.00E-02 PASS 4.19E-03 7.26E-05 4.39E-03 3.99E-03 2.00E-02 PASS 4.16E-03 1.12E-04 4.47E-03 3.86E-03 2.00E-02 PASS 4.22E-03 5.67E-05 4.38E-03 4.07E-03 2.00E-02 PASS 4.16E-03 1.07E-04 4.45E-03 3.87E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 484 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.239. Plot of Output Voltage Swing High IL= 0mA @ 5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 485 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.239. Raw data for Output Voltage Swing High IL= 0mA @ 5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.97E-03 4.20E-03 3.93E-03 4.10E-03 4.02E-03 3.90E-03 4.03E-03 3.93E-03 3.93E-03 4.08E-03 3.98E-03 10 3.98E-03 4.05E-03 3.85E-03 4.08E-03 3.95E-03 3.90E-03 4.05E-03 4.05E-03 3.78E-03 4.10E-03 3.95E-03 20 4.08E-03 4.15E-03 3.93E-03 4.13E-03 3.96E-03 4.05E-03 4.20E-03 4.18E-03 4.05E-03 4.11E-03 4.05E-03 30 4.14E-03 4.26E-03 3.95E-03 4.05E-03 3.99E-03 4.07E-03 4.17E-03 4.05E-03 4.00E-03 4.21E-03 4.04E-03 50 4.07E-03 4.17E-03 3.88E-03 3.99E-03 3.95E-03 4.22E-03 4.00E-03 4.22E-03 4.09E-03 4.24E-03 4.00E-03 60 4.17E-03 4.27E-03 4.01E-03 4.16E-03 4.16E-03 4.12E-03 4.14E-03 4.22E-03 4.06E-03 4.21E-03 4.09E-03 70 3.93E-03 4.24E-03 3.81E-03 4.08E-03 3.85E-03 4.29E-03 4.17E-03 4.19E-03 4.12E-03 4.08E-03 4.06E-03 4.04E-03 1.08E-04 4.34E-03 3.75E-03 3.98E-03 9.04E-05 4.23E-03 3.73E-03 4.05E-03 9.97E-05 4.32E-03 3.78E-03 4.08E-03 1.24E-04 4.42E-03 3.74E-03 4.01E-03 1.12E-04 4.32E-03 3.71E-03 4.15E-03 9.29E-05 4.41E-03 3.90E-03 3.98E-03 1.77E-04 4.47E-03 3.50E-03 3.97E-03 7.70E-05 4.19E-03 3.76E-03 1.00E-02 PASS 3.98E-03 1.33E-04 4.34E-03 3.61E-03 2.00E-02 PASS 4.12E-03 7.05E-05 4.31E-03 3.92E-03 2.00E-02 PASS 4.10E-03 8.72E-05 4.34E-03 3.86E-03 2.00E-02 PASS 4.15E-03 1.05E-04 4.44E-03 3.87E-03 2.00E-02 PASS 4.15E-03 6.63E-05 4.33E-03 3.97E-03 2.00E-02 PASS 4.17E-03 7.97E-05 4.39E-03 3.95E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 486 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 0mA @ 5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.240. Plot of Output Voltage Swing High IL= 0mA @ 5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 487 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.240. Raw data for Output Voltage Swing High IL= 0mA @ 5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 0mA @ 5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 4.07E-03 4.03E-03 3.86E-03 3.98E-03 4.02E-03 4.03E-03 4.07E-03 4.00E-03 3.76E-03 4.01E-03 4.20E-03 10 4.24E-03 4.15E-03 3.88E-03 3.88E-03 4.05E-03 4.18E-03 4.09E-03 4.14E-03 3.77E-03 4.07E-03 4.07E-03 20 4.27E-03 3.88E-03 3.91E-03 3.98E-03 4.08E-03 4.22E-03 3.95E-03 4.20E-03 4.03E-03 4.17E-03 4.17E-03 30 4.24E-03 4.11E-03 4.02E-03 3.99E-03 4.14E-03 4.27E-03 4.09E-03 4.32E-03 3.94E-03 4.29E-03 4.24E-03 50 4.37E-03 4.32E-03 4.12E-03 4.09E-03 4.19E-03 4.36E-03 4.20E-03 4.20E-03 4.04E-03 4.20E-03 4.22E-03 60 4.36E-03 4.16E-03 3.99E-03 4.24E-03 4.26E-03 4.27E-03 4.21E-03 4.36E-03 4.11E-03 4.36E-03 4.17E-03 70 4.17E-03 3.95E-03 3.98E-03 3.81E-03 4.00E-03 4.20E-03 4.13E-03 4.19E-03 4.00E-03 4.15E-03 4.25E-03 3.99E-03 8.04E-05 4.21E-03 3.77E-03 4.04E-03 1.61E-04 4.48E-03 3.60E-03 4.02E-03 1.58E-04 4.46E-03 3.59E-03 4.10E-03 9.97E-05 4.37E-03 3.83E-03 4.22E-03 1.23E-04 4.55E-03 3.88E-03 4.20E-03 1.38E-04 4.58E-03 3.82E-03 3.98E-03 1.29E-04 4.33E-03 3.63E-03 3.97E-03 1.23E-04 4.31E-03 3.64E-03 1.00E-02 PASS 4.05E-03 1.62E-04 4.50E-03 3.60E-03 2.00E-02 PASS 4.11E-03 1.18E-04 4.44E-03 3.79E-03 2.00E-02 PASS 4.18E-03 1.62E-04 4.63E-03 3.74E-03 2.00E-02 PASS 4.20E-03 1.13E-04 4.51E-03 3.89E-03 2.00E-02 PASS 4.26E-03 1.06E-04 4.55E-03 3.97E-03 2.00E-02 PASS 4.13E-03 8.02E-05 4.35E-03 3.91E-03 2.00E-02 PASS An ISO 9001:2000 Certified Company 488 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.241. Plot of Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 489 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.241. Raw data for Output Voltage Swing High IL= 1mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.03E-02 6.85E-02 6.85E-02 6.79E-02 6.85E-02 7.02E-02 6.85E-02 6.87E-02 6.80E-02 6.96E-02 6.95E-02 10 7.20E-02 6.93E-02 6.95E-02 6.88E-02 6.95E-02 7.06E-02 6.87E-02 6.94E-02 6.83E-02 7.03E-02 6.92E-02 20 7.29E-02 6.98E-02 7.03E-02 6.93E-02 7.01E-02 7.09E-02 6.92E-02 6.95E-02 6.86E-02 7.05E-02 6.93E-02 30 7.33E-02 7.03E-02 7.07E-02 6.99E-02 7.06E-02 7.13E-02 6.94E-02 6.99E-02 6.90E-02 7.08E-02 6.95E-02 50 7.44E-02 7.11E-02 7.10E-02 7.04E-02 7.12E-02 7.19E-02 6.98E-02 7.06E-02 6.98E-02 7.10E-02 6.96E-02 60 7.44E-02 7.11E-02 7.13E-02 7.07E-02 7.15E-02 7.19E-02 7.03E-02 7.07E-02 6.98E-02 7.13E-02 6.96E-02 70 7.27E-02 6.99E-02 7.02E-02 6.94E-02 7.03E-02 7.14E-02 6.96E-02 7.00E-02 6.90E-02 7.10E-02 6.94E-02 6.87E-02 9.27E-04 7.13E-02 6.62E-02 6.98E-02 1.25E-03 7.32E-02 6.64E-02 7.05E-02 1.40E-03 7.43E-02 6.66E-02 7.10E-02 1.34E-03 7.46E-02 6.73E-02 7.16E-02 1.56E-03 7.59E-02 6.73E-02 7.18E-02 1.51E-03 7.59E-02 6.77E-02 7.05E-02 1.28E-03 7.40E-02 6.70E-02 6.90E-02 8.74E-04 7.14E-02 6.66E-02 1.50E-01 PASS 6.95E-02 9.83E-04 7.22E-02 6.68E-02 1.50E-01 PASS 6.97E-02 9.49E-04 7.23E-02 6.71E-02 1.50E-01 PASS 7.01E-02 9.26E-04 7.26E-02 6.75E-02 1.50E-01 PASS 7.06E-02 8.81E-04 7.31E-02 6.82E-02 1.50E-01 PASS 7.08E-02 8.34E-04 7.31E-02 6.85E-02 1.50E-01 PASS 7.02E-02 1.02E-03 7.30E-02 6.74E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 490 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.242. Plot of Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 491 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.242. Raw data for Output Voltage Swing High IL= 1mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.86E-02 6.95E-02 6.59E-02 6.99E-02 6.69E-02 6.83E-02 6.88E-02 6.62E-02 6.75E-02 6.89E-02 6.85E-02 10 7.02E-02 7.08E-02 6.69E-02 7.09E-02 6.77E-02 6.86E-02 6.93E-02 6.68E-02 6.80E-02 6.93E-02 6.83E-02 20 7.08E-02 7.14E-02 6.72E-02 7.17E-02 6.84E-02 6.89E-02 6.96E-02 6.71E-02 6.83E-02 6.98E-02 6.83E-02 30 7.15E-02 7.19E-02 6.80E-02 7.22E-02 6.89E-02 6.94E-02 7.01E-02 6.75E-02 6.86E-02 7.00E-02 6.84E-02 50 7.25E-02 7.26E-02 6.84E-02 7.31E-02 6.95E-02 7.00E-02 7.06E-02 6.79E-02 6.91E-02 7.06E-02 6.85E-02 60 7.26E-02 7.28E-02 6.88E-02 7.30E-02 6.97E-02 7.03E-02 7.04E-02 6.80E-02 6.92E-02 7.05E-02 6.84E-02 70 7.08E-02 7.14E-02 6.75E-02 7.20E-02 6.88E-02 6.93E-02 7.01E-02 6.75E-02 6.87E-02 7.03E-02 6.85E-02 6.82E-02 1.71E-03 7.28E-02 6.35E-02 6.93E-02 1.85E-03 7.44E-02 6.42E-02 6.99E-02 1.97E-03 7.53E-02 6.45E-02 7.05E-02 1.91E-03 7.57E-02 6.53E-02 7.12E-02 2.10E-03 7.70E-02 6.55E-02 7.13E-02 1.99E-03 7.68E-02 6.59E-02 7.01E-02 1.89E-03 7.53E-02 6.49E-02 6.80E-02 1.10E-03 7.10E-02 6.49E-02 1.50E-01 PASS 6.84E-02 1.07E-03 7.13E-02 6.55E-02 1.50E-01 PASS 6.87E-02 1.11E-03 7.18E-02 6.57E-02 1.50E-01 PASS 6.91E-02 1.07E-03 7.21E-02 6.62E-02 1.50E-01 PASS 6.96E-02 1.16E-03 7.28E-02 6.65E-02 1.50E-01 PASS 6.97E-02 1.09E-03 7.27E-02 6.67E-02 1.50E-01 PASS 6.92E-02 1.13E-03 7.23E-02 6.61E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 492 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.243. Plot of Output Voltage Swing High IL= 1mA @ 5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 493 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.243. Raw data for Output Voltage Swing High IL= 1mA @ 5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 6.84E-02 7.00E-02 6.58E-02 7.01E-02 6.72E-02 6.85E-02 6.84E-02 6.62E-02 6.80E-02 6.89E-02 6.85E-02 10 7.03E-02 7.11E-02 6.66E-02 7.08E-02 6.83E-02 6.88E-02 6.88E-02 6.68E-02 6.84E-02 6.94E-02 6.84E-02 20 7.10E-02 7.16E-02 6.71E-02 7.17E-02 6.90E-02 6.92E-02 6.92E-02 6.70E-02 6.85E-02 7.00E-02 6.84E-02 30 7.16E-02 7.22E-02 6.75E-02 7.20E-02 6.94E-02 6.95E-02 6.95E-02 6.76E-02 6.90E-02 7.02E-02 6.84E-02 50 7.25E-02 7.30E-02 6.82E-02 7.28E-02 7.03E-02 7.00E-02 7.03E-02 6.81E-02 6.96E-02 7.06E-02 6.87E-02 60 7.23E-02 7.29E-02 6.84E-02 7.30E-02 7.03E-02 7.03E-02 7.05E-02 6.81E-02 6.97E-02 7.09E-02 6.87E-02 70 7.10E-02 7.18E-02 6.75E-02 7.16E-02 6.92E-02 6.94E-02 6.96E-02 6.74E-02 6.91E-02 7.04E-02 6.86E-02 6.83E-02 1.83E-03 7.33E-02 6.33E-02 6.94E-02 1.91E-03 7.47E-02 6.42E-02 7.01E-02 1.98E-03 7.55E-02 6.46E-02 7.05E-02 2.03E-03 7.61E-02 6.50E-02 7.13E-02 2.07E-03 7.70E-02 6.57E-02 7.14E-02 2.00E-03 7.68E-02 6.59E-02 7.02E-02 1.85E-03 7.53E-02 6.51E-02 6.80E-02 1.06E-03 7.09E-02 6.51E-02 1.50E-01 PASS 6.84E-02 9.83E-04 7.11E-02 6.57E-02 1.50E-01 PASS 6.88E-02 1.14E-03 7.19E-02 6.57E-02 1.50E-01 PASS 6.92E-02 9.75E-04 7.18E-02 6.65E-02 1.50E-01 PASS 6.97E-02 9.98E-04 7.24E-02 6.70E-02 1.50E-01 PASS 6.99E-02 1.12E-03 7.30E-02 6.68E-02 1.50E-01 PASS 6.92E-02 1.11E-03 7.22E-02 6.61E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 494 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 1mA @ 5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.60E-01 1.40E-01 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.244. Plot of Output Voltage Swing High IL= 1mA @ 5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 495 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.244. Raw data for Output Voltage Swing High IL= 1mA @ 5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 1mA @ 5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.01E-02 6.79E-02 6.91E-02 6.78E-02 6.86E-02 7.01E-02 6.84E-02 6.90E-02 6.77E-02 6.96E-02 6.97E-02 10 7.17E-02 6.90E-02 7.00E-02 6.90E-02 6.99E-02 7.06E-02 6.88E-02 6.97E-02 6.80E-02 7.00E-02 6.95E-02 20 7.23E-02 6.96E-02 7.06E-02 6.93E-02 7.02E-02 7.09E-02 6.89E-02 6.98E-02 6.87E-02 7.03E-02 6.95E-02 30 7.29E-02 7.01E-02 7.11E-02 6.98E-02 7.08E-02 7.11E-02 6.94E-02 7.01E-02 6.88E-02 7.08E-02 6.96E-02 50 7.37E-02 7.07E-02 7.19E-02 7.06E-02 7.15E-02 7.17E-02 6.99E-02 7.06E-02 6.93E-02 7.11E-02 6.96E-02 60 7.37E-02 7.08E-02 7.17E-02 7.06E-02 7.17E-02 7.19E-02 7.00E-02 7.08E-02 6.94E-02 7.13E-02 6.95E-02 70 7.23E-02 6.96E-02 7.07E-02 6.94E-02 7.06E-02 7.13E-02 6.94E-02 7.03E-02 6.90E-02 7.06E-02 6.97E-02 6.87E-02 9.30E-04 7.12E-02 6.61E-02 6.99E-02 1.08E-03 7.29E-02 6.70E-02 7.04E-02 1.17E-03 7.36E-02 6.72E-02 7.09E-02 1.18E-03 7.42E-02 6.77E-02 7.17E-02 1.25E-03 7.51E-02 6.82E-02 7.17E-02 1.24E-03 7.51E-02 6.83E-02 7.05E-02 1.16E-03 7.37E-02 6.73E-02 6.90E-02 9.66E-04 7.16E-02 6.63E-02 1.50E-01 PASS 6.94E-02 1.05E-03 7.23E-02 6.66E-02 1.50E-01 PASS 6.97E-02 9.15E-04 7.22E-02 6.72E-02 1.50E-01 PASS 7.00E-02 9.73E-04 7.27E-02 6.74E-02 1.50E-01 PASS 7.05E-02 9.63E-04 7.32E-02 6.79E-02 1.50E-01 PASS 7.07E-02 1.01E-03 7.35E-02 6.79E-02 1.50E-01 PASS 7.01E-02 9.38E-04 7.27E-02 6.75E-02 1.50E-01 PASS An ISO 9001:2000 Certified Company 496 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.245. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 497 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.245. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.25E-01 1.23E-01 1.24E-01 1.22E-01 1.23E-01 1.26E-01 1.23E-01 1.25E-01 1.23E-01 1.26E-01 1.25E-01 10 1.28E-01 1.24E-01 1.25E-01 1.23E-01 1.25E-01 1.26E-01 1.23E-01 1.25E-01 1.23E-01 1.26E-01 1.25E-01 20 1.28E-01 1.25E-01 1.26E-01 1.24E-01 1.25E-01 1.27E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.24E-01 30 1.29E-01 1.26E-01 1.27E-01 1.24E-01 1.26E-01 1.27E-01 1.24E-01 1.26E-01 1.24E-01 1.27E-01 1.25E-01 50 1.30E-01 1.27E-01 1.28E-01 1.26E-01 1.27E-01 1.28E-01 1.25E-01 1.26E-01 1.24E-01 1.27E-01 1.25E-01 60 1.31E-01 1.27E-01 1.28E-01 1.26E-01 1.27E-01 1.28E-01 1.25E-01 1.27E-01 1.25E-01 1.28E-01 1.25E-01 70 1.28E-01 1.25E-01 1.26E-01 1.24E-01 1.25E-01 1.28E-01 1.25E-01 1.26E-01 1.24E-01 1.27E-01 1.24E-01 1.24E-01 1.08E-03 1.27E-01 1.21E-01 1.25E-01 1.57E-03 1.29E-01 1.21E-01 1.26E-01 1.66E-03 1.30E-01 1.21E-01 1.26E-01 1.77E-03 1.31E-01 1.21E-01 1.27E-01 1.81E-03 1.32E-01 1.22E-01 1.28E-01 1.80E-03 1.33E-01 1.23E-01 1.26E-01 1.64E-03 1.30E-01 1.21E-01 1.24E-01 1.29E-03 1.28E-01 1.21E-01 2.50E-01 PASS 1.25E-01 1.38E-03 1.28E-01 1.21E-01 2.50E-01 PASS 1.25E-01 1.39E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.26E-01 1.44E-03 1.30E-01 1.22E-01 2.50E-01 PASS 1.26E-01 1.39E-03 1.30E-01 1.22E-01 2.50E-01 PASS 1.26E-01 1.37E-03 1.30E-01 1.23E-01 2.50E-01 PASS 1.26E-01 1.51E-03 1.30E-01 1.22E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 498 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.246. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 499 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.246. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.23E-01 1.25E-01 1.20E-01 1.25E-01 1.21E-01 1.23E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.24E-01 10 1.25E-01 1.27E-01 1.21E-01 1.27E-01 1.22E-01 1.24E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 20 1.25E-01 1.27E-01 1.22E-01 1.27E-01 1.23E-01 1.24E-01 1.25E-01 1.21E-01 1.23E-01 1.25E-01 1.23E-01 30 1.26E-01 1.28E-01 1.23E-01 1.28E-01 1.24E-01 1.25E-01 1.25E-01 1.22E-01 1.23E-01 1.26E-01 1.24E-01 50 1.28E-01 1.29E-01 1.23E-01 1.29E-01 1.24E-01 1.26E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.24E-01 60 1.28E-01 1.29E-01 1.23E-01 1.29E-01 1.25E-01 1.25E-01 1.26E-01 1.23E-01 1.24E-01 1.27E-01 1.24E-01 70 1.26E-01 1.27E-01 1.22E-01 1.27E-01 1.23E-01 1.25E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.23E-01 1.23E-01 2.36E-03 1.29E-01 1.16E-01 1.24E-01 2.55E-03 1.31E-01 1.17E-01 1.25E-01 2.58E-03 1.32E-01 1.18E-01 1.26E-01 2.45E-03 1.32E-01 1.19E-01 1.27E-01 2.64E-03 1.34E-01 1.19E-01 1.27E-01 2.72E-03 1.34E-01 1.19E-01 1.25E-01 2.37E-03 1.32E-01 1.19E-01 1.23E-01 1.62E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.23E-01 1.55E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.24E-01 1.66E-03 1.28E-01 1.19E-01 2.50E-01 PASS 1.24E-01 1.61E-03 1.29E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.58E-03 1.29E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.38E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.24E-01 1.58E-03 1.29E-01 1.20E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 500 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.247. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 501 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.247. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.23E-01 1.26E-01 1.20E-01 1.25E-01 1.22E-01 1.24E-01 1.24E-01 1.21E-01 1.23E-01 1.25E-01 1.24E-01 10 1.25E-01 1.27E-01 1.21E-01 1.26E-01 1.23E-01 1.24E-01 1.23E-01 1.21E-01 1.23E-01 1.25E-01 1.24E-01 20 1.26E-01 1.28E-01 1.21E-01 1.27E-01 1.23E-01 1.24E-01 1.24E-01 1.21E-01 1.24E-01 1.25E-01 1.24E-01 30 1.27E-01 1.28E-01 1.22E-01 1.28E-01 1.24E-01 1.25E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.24E-01 50 1.28E-01 1.29E-01 1.23E-01 1.29E-01 1.25E-01 1.25E-01 1.25E-01 1.22E-01 1.25E-01 1.26E-01 1.24E-01 60 1.28E-01 1.29E-01 1.23E-01 1.29E-01 1.25E-01 1.25E-01 1.25E-01 1.23E-01 1.25E-01 1.27E-01 1.24E-01 70 1.26E-01 1.28E-01 1.22E-01 1.27E-01 1.24E-01 1.25E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.24E-01 1.23E-01 2.35E-03 1.29E-01 1.17E-01 1.24E-01 2.62E-03 1.32E-01 1.17E-01 1.25E-01 2.60E-03 1.32E-01 1.18E-01 1.26E-01 2.58E-03 1.33E-01 1.19E-01 1.27E-01 2.69E-03 1.34E-01 1.19E-01 1.27E-01 2.75E-03 1.34E-01 1.19E-01 1.25E-01 2.45E-03 1.32E-01 1.19E-01 1.23E-01 1.50E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.23E-01 1.50E-03 1.27E-01 1.19E-01 2.50E-01 PASS 1.24E-01 1.44E-03 1.28E-01 1.20E-01 2.50E-01 PASS 1.24E-01 1.46E-03 1.28E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.56E-03 1.29E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.37E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.24E-01 1.60E-03 1.29E-01 1.20E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 502 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 3.00E-01 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.248. Plot of Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 503 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.248. Raw data for Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.25E-01 1.23E-01 1.25E-01 1.22E-01 1.24E-01 1.26E-01 1.23E-01 1.25E-01 1.22E-01 1.26E-01 1.25E-01 10 1.27E-01 1.24E-01 1.26E-01 1.23E-01 1.25E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.25E-01 20 1.28E-01 1.25E-01 1.26E-01 1.24E-01 1.25E-01 1.26E-01 1.24E-01 1.25E-01 1.23E-01 1.26E-01 1.25E-01 30 1.29E-01 1.25E-01 1.27E-01 1.25E-01 1.26E-01 1.27E-01 1.24E-01 1.26E-01 1.24E-01 1.27E-01 1.25E-01 50 1.30E-01 1.27E-01 1.28E-01 1.26E-01 1.27E-01 1.28E-01 1.25E-01 1.27E-01 1.24E-01 1.27E-01 1.25E-01 60 1.30E-01 1.27E-01 1.28E-01 1.26E-01 1.27E-01 1.28E-01 1.26E-01 1.27E-01 1.25E-01 1.28E-01 1.25E-01 70 1.28E-01 1.25E-01 1.27E-01 1.24E-01 1.26E-01 1.27E-01 1.25E-01 1.26E-01 1.24E-01 1.27E-01 1.25E-01 1.24E-01 1.23E-03 1.27E-01 1.20E-01 1.25E-01 1.56E-03 1.29E-01 1.21E-01 1.26E-01 1.59E-03 1.30E-01 1.21E-01 1.26E-01 1.57E-03 1.31E-01 1.22E-01 1.27E-01 1.63E-03 1.32E-01 1.23E-01 1.28E-01 1.58E-03 1.32E-01 1.23E-01 1.26E-01 1.53E-03 1.30E-01 1.22E-01 1.24E-01 1.49E-03 1.28E-01 1.20E-01 2.50E-01 PASS 1.25E-01 1.41E-03 1.28E-01 1.21E-01 2.50E-01 PASS 1.25E-01 1.44E-03 1.29E-01 1.21E-01 2.50E-01 PASS 1.26E-01 1.54E-03 1.30E-01 1.21E-01 2.50E-01 PASS 1.26E-01 1.42E-03 1.30E-01 1.22E-01 2.50E-01 PASS 1.27E-01 1.50E-03 1.31E-01 1.23E-01 2.50E-01 PASS 1.26E-01 1.38E-03 1.30E-01 1.22E-01 2.50E-01 PASS An ISO 9001:2000 Certified Company 504 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.249. Plot of Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 505 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.249. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.51E-02 1.50E-02 1.48E-02 1.53E-02 1.49E-02 1.51E-02 1.48E-02 1.47E-02 1.49E-02 1.50E-02 1.48E-02 10 1.53E-02 1.52E-02 1.50E-02 1.55E-02 1.53E-02 1.50E-02 1.49E-02 1.48E-02 1.50E-02 1.52E-02 1.48E-02 20 1.53E-02 1.53E-02 1.50E-02 1.55E-02 1.53E-02 1.53E-02 1.52E-02 1.51E-02 1.52E-02 1.53E-02 1.49E-02 30 1.56E-02 1.55E-02 1.53E-02 1.58E-02 1.56E-02 1.55E-02 1.53E-02 1.52E-02 1.54E-02 1.54E-02 1.48E-02 50 1.57E-02 1.57E-02 1.54E-02 1.60E-02 1.57E-02 1.57E-02 1.56E-02 1.53E-02 1.57E-02 1.55E-02 1.50E-02 60 1.57E-02 1.56E-02 1.54E-02 1.59E-02 1.56E-02 1.57E-02 1.56E-02 1.54E-02 1.56E-02 1.56E-02 1.49E-02 70 1.54E-02 1.55E-02 1.53E-02 1.57E-02 1.54E-02 1.54E-02 1.52E-02 1.51E-02 1.53E-02 1.54E-02 1.50E-02 1.50E-02 1.76E-04 1.55E-02 1.45E-02 1.53E-02 1.57E-04 1.57E-02 1.48E-02 1.53E-02 1.73E-04 1.58E-02 1.48E-02 1.55E-02 2.12E-04 1.61E-02 1.50E-02 1.57E-02 2.09E-04 1.63E-02 1.51E-02 1.57E-02 1.86E-04 1.62E-02 1.51E-02 1.54E-02 1.90E-04 1.60E-02 1.49E-02 1.49E-02 1.66E-04 1.54E-02 1.45E-02 3.00E-02 PASS 1.50E-02 1.33E-04 1.53E-02 1.46E-02 6.00E-02 PASS 1.52E-02 1.03E-04 1.55E-02 1.49E-02 6.00E-02 PASS 1.53E-02 1.28E-04 1.57E-02 1.50E-02 6.00E-02 PASS 1.56E-02 1.67E-04 1.60E-02 1.51E-02 6.00E-02 PASS 1.56E-02 1.18E-04 1.59E-02 1.53E-02 6.00E-02 PASS 1.53E-02 1.50E-04 1.57E-02 1.49E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 506 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.250. Plot of Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 507 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.250. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.54E-02 1.54E-02 1.54E-02 1.52E-02 1.54E-02 1.51E-02 1.56E-02 1.52E-02 1.52E-02 1.49E-02 1.52E-02 10 1.56E-02 1.58E-02 1.55E-02 1.56E-02 1.56E-02 1.51E-02 1.55E-02 1.54E-02 1.52E-02 1.48E-02 1.51E-02 20 1.59E-02 1.59E-02 1.56E-02 1.57E-02 1.58E-02 1.53E-02 1.58E-02 1.55E-02 1.54E-02 1.50E-02 1.51E-02 30 1.60E-02 1.60E-02 1.57E-02 1.59E-02 1.59E-02 1.54E-02 1.59E-02 1.57E-02 1.56E-02 1.50E-02 1.52E-02 50 1.64E-02 1.63E-02 1.60E-02 1.61E-02 1.61E-02 1.56E-02 1.62E-02 1.58E-02 1.59E-02 1.53E-02 1.52E-02 60 1.63E-02 1.64E-02 1.60E-02 1.62E-02 1.62E-02 1.58E-02 1.62E-02 1.59E-02 1.61E-02 1.52E-02 1.51E-02 70 1.59E-02 1.59E-02 1.57E-02 1.58E-02 1.58E-02 1.53E-02 1.58E-02 1.56E-02 1.56E-02 1.50E-02 1.51E-02 1.53E-02 6.69E-05 1.55E-02 1.52E-02 1.56E-02 1.03E-04 1.59E-02 1.53E-02 1.58E-02 1.39E-04 1.62E-02 1.54E-02 1.59E-02 1.18E-04 1.62E-02 1.56E-02 1.62E-02 1.40E-04 1.66E-02 1.58E-02 1.62E-02 1.56E-04 1.66E-02 1.58E-02 1.58E-02 1.03E-04 1.61E-02 1.55E-02 1.52E-02 2.68E-04 1.59E-02 1.44E-02 3.00E-02 PASS 1.52E-02 2.73E-04 1.60E-02 1.45E-02 6.00E-02 PASS 1.54E-02 2.94E-04 1.62E-02 1.46E-02 6.00E-02 PASS 1.55E-02 3.11E-04 1.64E-02 1.47E-02 6.00E-02 PASS 1.58E-02 3.23E-04 1.67E-02 1.49E-02 6.00E-02 PASS 1.58E-02 3.83E-04 1.69E-02 1.48E-02 6.00E-02 PASS 1.55E-02 2.99E-04 1.63E-02 1.46E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 508 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.251. Plot of Output Voltage Swing Low IL= 0mA @ 5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 509 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.251. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.51E-02 1.48E-02 1.50E-02 1.50E-02 1.49E-02 1.47E-02 1.51E-02 1.52E-02 1.51E-02 1.47E-02 1.48E-02 10 1.53E-02 1.52E-02 1.52E-02 1.54E-02 1.55E-02 1.47E-02 1.52E-02 1.53E-02 1.52E-02 1.48E-02 1.46E-02 20 1.53E-02 1.54E-02 1.53E-02 1.55E-02 1.57E-02 1.49E-02 1.56E-02 1.54E-02 1.54E-02 1.50E-02 1.47E-02 30 1.57E-02 1.55E-02 1.56E-02 1.54E-02 1.58E-02 1.51E-02 1.57E-02 1.55E-02 1.54E-02 1.52E-02 1.46E-02 50 1.58E-02 1.56E-02 1.57E-02 1.58E-02 1.59E-02 1.53E-02 1.58E-02 1.57E-02 1.58E-02 1.54E-02 1.46E-02 60 1.59E-02 1.58E-02 1.58E-02 1.60E-02 1.60E-02 1.53E-02 1.59E-02 1.58E-02 1.58E-02 1.55E-02 1.47E-02 70 1.56E-02 1.54E-02 1.55E-02 1.56E-02 1.58E-02 1.51E-02 1.56E-02 1.55E-02 1.55E-02 1.51E-02 1.46E-02 1.49E-02 1.17E-04 1.53E-02 1.46E-02 1.53E-02 1.14E-04 1.56E-02 1.50E-02 1.54E-02 1.61E-04 1.59E-02 1.50E-02 1.56E-02 1.55E-04 1.60E-02 1.52E-02 1.58E-02 1.20E-04 1.61E-02 1.55E-02 1.59E-02 1.23E-04 1.62E-02 1.56E-02 1.56E-02 1.43E-04 1.60E-02 1.52E-02 1.50E-02 2.40E-04 1.56E-02 1.43E-02 3.00E-02 PASS 1.51E-02 2.54E-04 1.58E-02 1.44E-02 6.00E-02 PASS 1.53E-02 2.94E-04 1.61E-02 1.44E-02 6.00E-02 PASS 1.54E-02 2.41E-04 1.60E-02 1.47E-02 6.00E-02 PASS 1.56E-02 2.35E-04 1.63E-02 1.50E-02 6.00E-02 PASS 1.56E-02 2.34E-04 1.63E-02 1.50E-02 6.00E-02 PASS 1.54E-02 2.28E-04 1.60E-02 1.47E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 510 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 0mA @ 5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.252. Plot of Output Voltage Swing Low IL= 0mA @ 5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 511 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.252. Raw data for Output Voltage Swing Low IL= 0mA @ 5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 0mA @ 5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 1.52E-02 1.49E-02 1.51E-02 1.56E-02 1.52E-02 1.51E-02 1.52E-02 1.50E-02 1.52E-02 1.52E-02 1.53E-02 10 1.54E-02 1.54E-02 1.55E-02 1.58E-02 1.56E-02 1.52E-02 1.53E-02 1.51E-02 1.54E-02 1.54E-02 1.51E-02 20 1.54E-02 1.54E-02 1.56E-02 1.59E-02 1.57E-02 1.54E-02 1.52E-02 1.53E-02 1.55E-02 1.53E-02 1.52E-02 30 1.56E-02 1.56E-02 1.58E-02 1.60E-02 1.58E-02 1.56E-02 1.55E-02 1.55E-02 1.58E-02 1.57E-02 1.52E-02 50 1.58E-02 1.59E-02 1.59E-02 1.62E-02 1.60E-02 1.58E-02 1.56E-02 1.57E-02 1.58E-02 1.58E-02 1.52E-02 60 1.58E-02 1.59E-02 1.59E-02 1.64E-02 1.60E-02 1.58E-02 1.58E-02 1.55E-02 1.59E-02 1.58E-02 1.53E-02 70 1.56E-02 1.55E-02 1.57E-02 1.60E-02 1.58E-02 1.56E-02 1.54E-02 1.54E-02 1.58E-02 1.55E-02 1.52E-02 1.52E-02 2.67E-04 1.59E-02 1.45E-02 1.55E-02 1.74E-04 1.60E-02 1.51E-02 1.56E-02 2.20E-04 1.62E-02 1.50E-02 1.57E-02 1.88E-04 1.62E-02 1.52E-02 1.60E-02 1.58E-04 1.64E-02 1.56E-02 1.60E-02 2.12E-04 1.66E-02 1.54E-02 1.57E-02 2.08E-04 1.63E-02 1.52E-02 1.52E-02 9.90E-05 1.54E-02 1.49E-02 3.00E-02 PASS 1.53E-02 1.28E-04 1.56E-02 1.49E-02 6.00E-02 PASS 1.54E-02 1.28E-04 1.57E-02 1.50E-02 6.00E-02 PASS 1.56E-02 1.26E-04 1.60E-02 1.53E-02 6.00E-02 PASS 1.57E-02 8.04E-05 1.60E-02 1.55E-02 6.00E-02 PASS 1.58E-02 1.33E-04 1.61E-02 1.54E-02 6.00E-02 PASS 1.56E-02 1.53E-04 1.60E-02 1.51E-02 6.00E-02 PASS An ISO 9001:2000 Certified Company 512 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.253. Plot of Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 513 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.253. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.41E-02 3.43E-02 3.41E-02 3.43E-02 3.39E-02 3.40E-02 3.38E-02 3.40E-02 3.42E-02 3.42E-02 3.38E-02 10 3.43E-02 3.46E-02 3.44E-02 3.46E-02 3.44E-02 3.41E-02 3.39E-02 3.39E-02 3.43E-02 3.43E-02 3.36E-02 20 3.47E-02 3.47E-02 3.46E-02 3.49E-02 3.46E-02 3.43E-02 3.40E-02 3.40E-02 3.45E-02 3.45E-02 3.38E-02 30 3.48E-02 3.48E-02 3.48E-02 3.50E-02 3.48E-02 3.46E-02 3.42E-02 3.40E-02 3.48E-02 3.48E-02 3.37E-02 50 3.53E-02 3.54E-02 3.52E-02 3.53E-02 3.49E-02 3.47E-02 3.44E-02 3.46E-02 3.49E-02 3.48E-02 3.38E-02 60 3.53E-02 3.54E-02 3.51E-02 3.54E-02 3.51E-02 3.49E-02 3.44E-02 3.45E-02 3.50E-02 3.50E-02 3.38E-02 70 3.49E-02 3.49E-02 3.47E-02 3.49E-02 3.47E-02 3.46E-02 3.43E-02 3.42E-02 3.48E-02 3.46E-02 3.36E-02 3.41E-02 1.73E-04 3.46E-02 3.36E-02 3.45E-02 1.16E-04 3.48E-02 3.41E-02 3.47E-02 1.34E-04 3.51E-02 3.43E-02 3.48E-02 9.88E-05 3.51E-02 3.46E-02 3.52E-02 1.77E-04 3.57E-02 3.47E-02 3.53E-02 1.39E-04 3.56E-02 3.49E-02 3.48E-02 8.44E-05 3.50E-02 3.46E-02 3.40E-02 1.81E-04 3.45E-02 3.35E-02 1.00E-01 PASS 3.41E-02 2.04E-04 3.47E-02 3.36E-02 1.00E-01 PASS 3.43E-02 2.49E-04 3.49E-02 3.36E-02 1.00E-01 PASS 3.45E-02 3.42E-04 3.54E-02 3.36E-02 1.00E-01 PASS 3.47E-02 2.02E-04 3.53E-02 3.41E-02 1.00E-01 PASS 3.48E-02 3.05E-04 3.56E-02 3.39E-02 1.00E-01 PASS 3.45E-02 2.58E-04 3.52E-02 3.38E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 514 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.254. Plot of Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 515 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.254. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.47E-02 3.46E-02 3.40E-02 3.48E-02 3.43E-02 3.43E-02 3.46E-02 3.40E-02 3.43E-02 3.39E-02 3.46E-02 10 3.51E-02 3.49E-02 3.44E-02 3.52E-02 3.48E-02 3.43E-02 3.47E-02 3.40E-02 3.44E-02 3.40E-02 3.44E-02 20 3.53E-02 3.53E-02 3.45E-02 3.53E-02 3.50E-02 3.45E-02 3.50E-02 3.41E-02 3.45E-02 3.41E-02 3.43E-02 30 3.57E-02 3.53E-02 3.48E-02 3.56E-02 3.54E-02 3.46E-02 3.50E-02 3.44E-02 3.48E-02 3.42E-02 3.44E-02 50 3.60E-02 3.57E-02 3.52E-02 3.60E-02 3.56E-02 3.48E-02 3.54E-02 3.47E-02 3.50E-02 3.48E-02 3.45E-02 60 3.63E-02 3.58E-02 3.53E-02 3.59E-02 3.58E-02 3.51E-02 3.53E-02 3.46E-02 3.52E-02 3.47E-02 3.45E-02 70 3.55E-02 3.53E-02 3.46E-02 3.55E-02 3.53E-02 3.48E-02 3.53E-02 3.44E-02 3.47E-02 3.43E-02 3.45E-02 3.45E-02 3.28E-04 3.54E-02 3.36E-02 3.49E-02 3.04E-04 3.57E-02 3.40E-02 3.51E-02 3.72E-04 3.61E-02 3.41E-02 3.53E-02 3.41E-04 3.63E-02 3.44E-02 3.57E-02 3.46E-04 3.67E-02 3.48E-02 3.58E-02 3.37E-04 3.67E-02 3.49E-02 3.52E-02 3.47E-04 3.62E-02 3.43E-02 3.42E-02 2.78E-04 3.50E-02 3.35E-02 1.00E-01 PASS 3.43E-02 2.99E-04 3.51E-02 3.35E-02 1.00E-01 PASS 3.45E-02 3.87E-04 3.55E-02 3.34E-02 1.00E-01 PASS 3.46E-02 3.04E-04 3.54E-02 3.38E-02 1.00E-01 PASS 3.49E-02 2.75E-04 3.57E-02 3.42E-02 1.00E-01 PASS 3.50E-02 3.35E-04 3.59E-02 3.41E-02 1.00E-01 PASS 3.47E-02 4.02E-04 3.58E-02 3.36E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 516 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.255. Plot of Output Voltage Swing Low IL= 1mA @ 5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 517 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.255. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.45E-02 3.40E-02 3.37E-02 3.44E-02 3.41E-02 3.40E-02 3.44E-02 3.37E-02 3.43E-02 3.37E-02 3.38E-02 10 3.48E-02 3.45E-02 3.40E-02 3.47E-02 3.46E-02 3.41E-02 3.43E-02 3.39E-02 3.43E-02 3.37E-02 3.38E-02 20 3.52E-02 3.47E-02 3.41E-02 3.49E-02 3.46E-02 3.41E-02 3.45E-02 3.41E-02 3.44E-02 3.40E-02 3.38E-02 30 3.51E-02 3.49E-02 3.45E-02 3.52E-02 3.48E-02 3.42E-02 3.46E-02 3.43E-02 3.46E-02 3.41E-02 3.37E-02 50 3.57E-02 3.52E-02 3.48E-02 3.55E-02 3.53E-02 3.45E-02 3.49E-02 3.44E-02 3.50E-02 3.44E-02 3.38E-02 60 3.57E-02 3.51E-02 3.49E-02 3.56E-02 3.55E-02 3.45E-02 3.50E-02 3.45E-02 3.50E-02 3.45E-02 3.39E-02 70 3.53E-02 3.47E-02 3.41E-02 3.51E-02 3.49E-02 3.44E-02 3.45E-02 3.43E-02 3.48E-02 3.42E-02 3.37E-02 3.41E-02 3.07E-04 3.50E-02 3.33E-02 3.45E-02 2.88E-04 3.53E-02 3.37E-02 3.47E-02 3.89E-04 3.58E-02 3.36E-02 3.49E-02 2.74E-04 3.57E-02 3.41E-02 3.53E-02 3.11E-04 3.62E-02 3.45E-02 3.54E-02 3.26E-04 3.62E-02 3.45E-02 3.48E-02 4.51E-04 3.60E-02 3.36E-02 3.40E-02 2.91E-04 3.48E-02 3.32E-02 1.00E-01 PASS 3.41E-02 2.78E-04 3.48E-02 3.33E-02 1.00E-01 PASS 3.42E-02 2.34E-04 3.49E-02 3.36E-02 1.00E-01 PASS 3.44E-02 2.32E-04 3.50E-02 3.37E-02 1.00E-01 PASS 3.46E-02 3.01E-04 3.55E-02 3.38E-02 1.00E-01 PASS 3.47E-02 2.74E-04 3.55E-02 3.40E-02 1.00E-01 PASS 3.44E-02 2.19E-04 3.50E-02 3.38E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 518 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 1mA @ 5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 1.20E-01 1.00E-01 8.00E-02 6.00E-02 4.00E-02 2.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.256. Plot of Output Voltage Swing Low IL= 1mA @ 5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 519 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.256. Raw data for Output Voltage Swing Low IL= 1mA @ 5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 1mA @ 5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 3.44E-02 3.44E-02 3.47E-02 3.48E-02 3.43E-02 3.45E-02 3.40E-02 3.41E-02 3.47E-02 3.45E-02 3.42E-02 10 3.48E-02 3.47E-02 3.49E-02 3.50E-02 3.47E-02 3.46E-02 3.42E-02 3.43E-02 3.48E-02 3.45E-02 3.40E-02 20 3.50E-02 3.49E-02 3.51E-02 3.53E-02 3.49E-02 3.47E-02 3.44E-02 3.43E-02 3.52E-02 3.47E-02 3.41E-02 30 3.52E-02 3.51E-02 3.52E-02 3.53E-02 3.50E-02 3.48E-02 3.45E-02 3.45E-02 3.52E-02 3.49E-02 3.40E-02 50 3.57E-02 3.53E-02 3.57E-02 3.57E-02 3.54E-02 3.52E-02 3.48E-02 3.47E-02 3.53E-02 3.51E-02 3.41E-02 60 3.57E-02 3.55E-02 3.56E-02 3.58E-02 3.56E-02 3.53E-02 3.50E-02 3.48E-02 3.55E-02 3.51E-02 3.43E-02 70 3.53E-02 3.49E-02 3.50E-02 3.52E-02 3.50E-02 3.48E-02 3.47E-02 3.45E-02 3.51E-02 3.49E-02 3.42E-02 3.45E-02 1.95E-04 3.50E-02 3.40E-02 3.48E-02 1.45E-04 3.52E-02 3.44E-02 3.50E-02 1.44E-04 3.54E-02 3.46E-02 3.51E-02 1.23E-04 3.55E-02 3.48E-02 3.55E-02 1.79E-04 3.60E-02 3.51E-02 3.56E-02 1.43E-04 3.60E-02 3.52E-02 3.51E-02 1.64E-04 3.55E-02 3.46E-02 3.44E-02 2.88E-04 3.52E-02 3.36E-02 1.00E-01 PASS 3.45E-02 2.35E-04 3.51E-02 3.38E-02 1.00E-01 PASS 3.47E-02 3.42E-04 3.56E-02 3.37E-02 1.00E-01 PASS 3.48E-02 2.64E-04 3.55E-02 3.40E-02 1.00E-01 PASS 3.50E-02 2.82E-04 3.58E-02 3.42E-02 1.00E-01 PASS 3.51E-02 2.35E-04 3.58E-02 3.45E-02 1.00E-01 PASS 3.48E-02 1.94E-04 3.53E-02 3.43E-02 1.00E-01 PASS An ISO 9001:2000 Certified Company 520 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.257. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 521 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.257. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.34E-02 7.40E-02 7.38E-02 7.33E-02 7.34E-02 7.34E-02 7.34E-02 7.33E-02 7.38E-02 7.41E-02 7.27E-02 10 7.39E-02 7.45E-02 7.41E-02 7.36E-02 7.36E-02 7.33E-02 7.32E-02 7.37E-02 7.36E-02 7.39E-02 7.26E-02 20 7.45E-02 7.46E-02 7.46E-02 7.42E-02 7.38E-02 7.35E-02 7.32E-02 7.37E-02 7.37E-02 7.44E-02 7.25E-02 30 7.46E-02 7.50E-02 7.45E-02 7.46E-02 7.40E-02 7.41E-02 7.35E-02 7.38E-02 7.36E-02 7.44E-02 7.27E-02 50 7.49E-02 7.52E-02 7.53E-02 7.48E-02 7.44E-02 7.42E-02 7.37E-02 7.43E-02 7.43E-02 7.50E-02 7.28E-02 60 7.50E-02 7.53E-02 7.58E-02 7.51E-02 7.51E-02 7.45E-02 7.38E-02 7.45E-02 7.43E-02 7.48E-02 7.26E-02 70 7.43E-02 7.46E-02 7.49E-02 7.41E-02 7.40E-02 7.42E-02 7.37E-02 7.40E-02 7.43E-02 7.46E-02 7.27E-02 7.36E-02 2.79E-04 7.43E-02 7.28E-02 7.40E-02 3.61E-04 7.50E-02 7.30E-02 7.43E-02 3.21E-04 7.52E-02 7.35E-02 7.45E-02 3.82E-04 7.56E-02 7.35E-02 7.49E-02 3.48E-04 7.59E-02 7.40E-02 7.52E-02 3.43E-04 7.62E-02 7.43E-02 7.44E-02 3.75E-04 7.54E-02 7.33E-02 7.36E-02 3.60E-04 7.46E-02 7.26E-02 2.00E-01 PASS 7.35E-02 2.84E-04 7.43E-02 7.28E-02 2.00E-01 PASS 7.37E-02 4.59E-04 7.50E-02 7.24E-02 2.00E-01 PASS 7.39E-02 3.62E-04 7.49E-02 7.29E-02 2.00E-01 PASS 7.43E-02 4.56E-04 7.55E-02 7.30E-02 2.00E-01 PASS 7.44E-02 3.61E-04 7.54E-02 7.34E-02 2.00E-01 PASS 7.41E-02 3.15E-04 7.50E-02 7.33E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 522 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.258. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 523 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.258. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.44E-02 7.40E-02 7.30E-02 7.44E-02 7.37E-02 7.43E-02 7.41E-02 7.30E-02 7.39E-02 7.37E-02 7.43E-02 10 7.48E-02 7.47E-02 7.33E-02 7.47E-02 7.41E-02 7.43E-02 7.37E-02 7.33E-02 7.36E-02 7.36E-02 7.37E-02 20 7.49E-02 7.52E-02 7.38E-02 7.53E-02 7.47E-02 7.46E-02 7.43E-02 7.33E-02 7.40E-02 7.36E-02 7.39E-02 30 7.56E-02 7.49E-02 7.41E-02 7.57E-02 7.51E-02 7.48E-02 7.44E-02 7.38E-02 7.41E-02 7.39E-02 7.41E-02 50 7.63E-02 7.54E-02 7.46E-02 7.58E-02 7.53E-02 7.49E-02 7.49E-02 7.37E-02 7.45E-02 7.42E-02 7.43E-02 60 7.60E-02 7.58E-02 7.46E-02 7.61E-02 7.54E-02 7.50E-02 7.49E-02 7.43E-02 7.50E-02 7.48E-02 7.40E-02 70 7.52E-02 7.50E-02 7.39E-02 7.54E-02 7.49E-02 7.49E-02 7.45E-02 7.37E-02 7.42E-02 7.41E-02 7.43E-02 7.39E-02 5.98E-04 7.55E-02 7.23E-02 7.43E-02 6.41E-04 7.61E-02 7.26E-02 7.48E-02 5.67E-04 7.63E-02 7.32E-02 7.51E-02 6.27E-04 7.68E-02 7.34E-02 7.55E-02 6.17E-04 7.72E-02 7.38E-02 7.56E-02 6.07E-04 7.72E-02 7.39E-02 7.49E-02 5.78E-04 7.65E-02 7.33E-02 7.38E-02 5.01E-04 7.52E-02 7.24E-02 2.00E-01 PASS 7.37E-02 3.52E-04 7.46E-02 7.27E-02 2.00E-01 PASS 7.39E-02 5.44E-04 7.54E-02 7.24E-02 2.00E-01 PASS 7.42E-02 4.08E-04 7.53E-02 7.31E-02 2.00E-01 PASS 7.44E-02 4.99E-04 7.58E-02 7.31E-02 2.00E-01 PASS 7.48E-02 2.87E-04 7.56E-02 7.40E-02 2.00E-01 PASS 7.43E-02 4.39E-04 7.55E-02 7.31E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 524 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.259. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 525 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.259. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.37E-02 7.33E-02 7.27E-02 7.36E-02 7.31E-02 7.36E-02 7.35E-02 7.27E-02 7.35E-02 7.28E-02 7.35E-02 10 7.41E-02 7.41E-02 7.30E-02 7.39E-02 7.35E-02 7.34E-02 7.34E-02 7.27E-02 7.38E-02 7.32E-02 7.33E-02 20 7.43E-02 7.40E-02 7.30E-02 7.43E-02 7.38E-02 7.39E-02 7.38E-02 7.29E-02 7.35E-02 7.33E-02 7.27E-02 30 7.48E-02 7.43E-02 7.33E-02 7.49E-02 7.42E-02 7.39E-02 7.37E-02 7.27E-02 7.39E-02 7.38E-02 7.29E-02 50 7.53E-02 7.50E-02 7.42E-02 7.50E-02 7.46E-02 7.42E-02 7.39E-02 7.34E-02 7.43E-02 7.39E-02 7.34E-02 60 7.56E-02 7.49E-02 7.41E-02 7.54E-02 7.51E-02 7.44E-02 7.43E-02 7.37E-02 7.44E-02 7.39E-02 7.32E-02 70 7.48E-02 7.43E-02 7.29E-02 7.47E-02 7.39E-02 7.44E-02 7.35E-02 7.34E-02 7.39E-02 7.34E-02 7.36E-02 7.33E-02 4.11E-04 7.44E-02 7.21E-02 7.37E-02 4.48E-04 7.49E-02 7.25E-02 7.39E-02 5.38E-04 7.53E-02 7.24E-02 7.43E-02 6.50E-04 7.61E-02 7.25E-02 7.48E-02 4.40E-04 7.60E-02 7.36E-02 7.50E-02 5.99E-04 7.67E-02 7.34E-02 7.41E-02 7.66E-04 7.62E-02 7.20E-02 7.32E-02 4.15E-04 7.44E-02 7.21E-02 2.00E-01 PASS 7.33E-02 4.04E-04 7.44E-02 7.22E-02 2.00E-01 PASS 7.35E-02 3.98E-04 7.46E-02 7.24E-02 2.00E-01 PASS 7.36E-02 4.82E-04 7.49E-02 7.23E-02 2.00E-01 PASS 7.39E-02 3.40E-04 7.49E-02 7.30E-02 2.00E-01 PASS 7.41E-02 3.36E-04 7.50E-02 7.32E-02 2.00E-01 PASS 7.37E-02 4.01E-04 7.48E-02 7.26E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 526 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased 2.50E-01 2.00E-01 1.50E-01 1.00E-01 5.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.260. Plot of Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 527 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.260. Raw data for Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 7.39E-02 7.42E-02 7.47E-02 7.43E-02 7.37E-02 7.41E-02 7.40E-02 7.41E-02 7.43E-02 7.48E-02 7.35E-02 10 7.44E-02 7.47E-02 7.51E-02 7.46E-02 7.38E-02 7.43E-02 7.35E-02 7.43E-02 7.44E-02 7.46E-02 7.34E-02 20 7.50E-02 7.50E-02 7.52E-02 7.48E-02 7.45E-02 7.43E-02 7.36E-02 7.42E-02 7.47E-02 7.46E-02 7.31E-02 30 7.53E-02 7.54E-02 7.59E-02 7.51E-02 7.47E-02 7.43E-02 7.40E-02 7.44E-02 7.49E-02 7.51E-02 7.36E-02 50 7.58E-02 7.60E-02 7.61E-02 7.57E-02 7.53E-02 7.52E-02 7.44E-02 7.48E-02 7.53E-02 7.52E-02 7.35E-02 60 7.59E-02 7.61E-02 7.62E-02 7.59E-02 7.54E-02 7.51E-02 7.50E-02 7.48E-02 7.54E-02 7.55E-02 7.36E-02 70 7.51E-02 7.52E-02 7.53E-02 7.49E-02 7.43E-02 7.45E-02 7.40E-02 7.48E-02 7.51E-02 7.54E-02 7.41E-02 7.42E-02 4.13E-04 7.53E-02 7.30E-02 7.45E-02 4.79E-04 7.58E-02 7.32E-02 7.49E-02 2.63E-04 7.56E-02 7.42E-02 7.53E-02 4.44E-04 7.65E-02 7.41E-02 7.58E-02 2.98E-04 7.66E-02 7.49E-02 7.59E-02 3.01E-04 7.67E-02 7.51E-02 7.50E-02 3.86E-04 7.60E-02 7.39E-02 7.43E-02 3.36E-04 7.52E-02 7.33E-02 2.00E-01 PASS 7.42E-02 4.19E-04 7.53E-02 7.30E-02 2.00E-01 PASS 7.42E-02 4.30E-04 7.54E-02 7.31E-02 2.00E-01 PASS 7.45E-02 4.36E-04 7.57E-02 7.33E-02 2.00E-01 PASS 7.50E-02 3.73E-04 7.60E-02 7.40E-02 2.00E-01 PASS 7.52E-02 2.84E-04 7.59E-02 7.44E-02 2.00E-01 PASS 7.47E-02 5.13E-04 7.62E-02 7.33E-02 2.00E-01 PASS An ISO 9001:2000 Certified Company 528 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 5V #1 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.261. Plot of Positive Short-Circuit Current @ 5V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 529 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.261. Raw data for Positive Short-Circuit Current @ 5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 5V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.34E-02 -2.51E-02 -2.50E-02 -2.44E-02 -2.44E-02 -2.38E-02 -2.50E-02 -2.51E-02 -2.46E-02 -2.46E-02 -2.45E-02 10 -2.28E-02 -2.45E-02 -2.44E-02 -2.36E-02 -2.36E-02 -2.34E-02 -2.45E-02 -2.47E-02 -2.40E-02 -2.42E-02 -2.44E-02 20 -2.25E-02 -2.42E-02 -2.41E-02 -2.33E-02 -2.33E-02 -2.31E-02 -2.43E-02 -2.46E-02 -2.37E-02 -2.40E-02 -2.44E-02 30 -2.23E-02 -2.40E-02 -2.40E-02 -2.32E-02 -2.32E-02 -2.30E-02 -2.42E-02 -2.45E-02 -2.36E-02 -2.39E-02 -2.45E-02 50 -2.19E-02 -2.37E-02 -2.37E-02 -2.28E-02 -2.28E-02 -2.27E-02 -2.39E-02 -2.42E-02 -2.32E-02 -2.37E-02 -2.45E-02 60 -2.20E-02 -2.38E-02 -2.37E-02 -2.29E-02 -2.29E-02 -2.28E-02 -2.40E-02 -2.43E-02 -2.33E-02 -2.38E-02 -2.45E-02 70 -2.23E-02 -2.41E-02 -2.41E-02 -2.33E-02 -2.33E-02 -2.30E-02 -2.42E-02 -2.45E-02 -2.36E-02 -2.39E-02 -2.45E-02 -2.44E-02 6.61E-04 -2.26E-02 -2.63E-02 -2.38E-02 6.65E-04 -2.20E-02 -2.56E-02 -2.35E-02 7.01E-04 -2.16E-02 -2.54E-02 -2.33E-02 7.10E-04 -2.14E-02 -2.53E-02 -2.30E-02 7.42E-04 -2.09E-02 -2.50E-02 -2.31E-02 7.28E-04 -2.11E-02 -2.51E-02 -2.34E-02 7.32E-04 -2.14E-02 -2.54E-02 -2.46E-02 5.21E-04 -2.32E-02 -2.60E-02 -1.25E-02 PASS -2.42E-02 5.32E-04 -2.27E-02 -2.56E-02 -8.00E-03 PASS -2.40E-02 5.56E-04 -2.24E-02 -2.55E-02 -8.00E-03 PASS -2.38E-02 5.63E-04 -2.23E-02 -2.54E-02 -8.00E-03 PASS -2.36E-02 5.83E-04 -2.20E-02 -2.51E-02 -8.00E-03 PASS -2.36E-02 5.73E-04 -2.21E-02 -2.52E-02 -8.00E-03 PASS -2.38E-02 5.51E-04 -2.23E-02 -2.54E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 530 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 5V #2 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.262. Plot of Positive Short-Circuit Current @ 5V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 531 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.262. Raw data for Positive Short-Circuit Current @ 5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 5V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.37E-02 -2.42E-02 -2.59E-02 -2.36E-02 -2.50E-02 -2.51E-02 -2.42E-02 -2.58E-02 -2.52E-02 -2.50E-02 -2.50E-02 10 -2.29E-02 -2.35E-02 -2.51E-02 -2.28E-02 -2.41E-02 -2.48E-02 -2.36E-02 -2.53E-02 -2.46E-02 -2.47E-02 -2.50E-02 20 -2.25E-02 -2.32E-02 -2.48E-02 -2.24E-02 -2.37E-02 -2.46E-02 -2.34E-02 -2.51E-02 -2.43E-02 -2.45E-02 -2.50E-02 30 -2.23E-02 -2.30E-02 -2.46E-02 -2.23E-02 -2.35E-02 -2.45E-02 -2.33E-02 -2.49E-02 -2.42E-02 -2.44E-02 -2.50E-02 50 -2.19E-02 -2.27E-02 -2.43E-02 -2.19E-02 -2.31E-02 -2.43E-02 -2.30E-02 -2.46E-02 -2.38E-02 -2.41E-02 -2.50E-02 60 -2.20E-02 -2.28E-02 -2.44E-02 -2.20E-02 -2.32E-02 -2.44E-02 -2.31E-02 -2.48E-02 -2.39E-02 -2.42E-02 -2.51E-02 70 -2.24E-02 -2.32E-02 -2.47E-02 -2.24E-02 -2.36E-02 -2.45E-02 -2.33E-02 -2.49E-02 -2.42E-02 -2.44E-02 -2.50E-02 -2.45E-02 9.64E-04 -2.18E-02 -2.71E-02 -2.37E-02 9.47E-04 -2.11E-02 -2.63E-02 -2.33E-02 9.63E-04 -2.07E-02 -2.60E-02 -2.32E-02 9.77E-04 -2.05E-02 -2.58E-02 -2.28E-02 9.99E-04 -2.00E-02 -2.55E-02 -2.28E-02 9.89E-04 -2.01E-02 -2.56E-02 -2.33E-02 9.89E-04 -2.05E-02 -2.60E-02 -2.51E-02 5.82E-04 -2.35E-02 -2.66E-02 -1.25E-02 PASS -2.46E-02 6.19E-04 -2.29E-02 -2.63E-02 -8.00E-03 PASS -2.44E-02 6.24E-04 -2.27E-02 -2.61E-02 -8.00E-03 PASS -2.42E-02 6.18E-04 -2.25E-02 -2.59E-02 -8.00E-03 PASS -2.40E-02 6.34E-04 -2.22E-02 -2.57E-02 -8.00E-03 PASS -2.41E-02 6.28E-04 -2.23E-02 -2.58E-02 -8.00E-03 PASS -2.43E-02 6.00E-04 -2.26E-02 -2.59E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 532 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 5V #3 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.263. Plot of Positive Short-Circuit Current @ 5V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 533 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.263. Raw data for Positive Short-Circuit Current @ 5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 5V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.37E-02 -2.41E-02 -2.61E-02 -2.36E-02 -2.46E-02 -2.51E-02 -2.45E-02 -2.58E-02 -2.49E-02 -2.50E-02 -2.50E-02 10 -2.30E-02 -2.34E-02 -2.53E-02 -2.28E-02 -2.37E-02 -2.48E-02 -2.40E-02 -2.53E-02 -2.43E-02 -2.46E-02 -2.49E-02 20 -2.26E-02 -2.30E-02 -2.50E-02 -2.25E-02 -2.33E-02 -2.46E-02 -2.37E-02 -2.50E-02 -2.41E-02 -2.44E-02 -2.49E-02 30 -2.23E-02 -2.29E-02 -2.48E-02 -2.23E-02 -2.31E-02 -2.45E-02 -2.36E-02 -2.49E-02 -2.39E-02 -2.43E-02 -2.50E-02 50 -2.19E-02 -2.26E-02 -2.45E-02 -2.19E-02 -2.26E-02 -2.43E-02 -2.33E-02 -2.46E-02 -2.36E-02 -2.40E-02 -2.50E-02 60 -2.20E-02 -2.26E-02 -2.46E-02 -2.20E-02 -2.28E-02 -2.44E-02 -2.34E-02 -2.47E-02 -2.37E-02 -2.41E-02 -2.50E-02 70 -2.24E-02 -2.30E-02 -2.49E-02 -2.24E-02 -2.32E-02 -2.45E-02 -2.36E-02 -2.49E-02 -2.39E-02 -2.43E-02 -2.50E-02 -2.44E-02 9.97E-04 -2.17E-02 -2.71E-02 -2.36E-02 1.00E-03 -2.09E-02 -2.64E-02 -2.33E-02 1.02E-03 -2.05E-02 -2.61E-02 -2.31E-02 1.04E-03 -2.03E-02 -2.59E-02 -2.27E-02 1.05E-03 -1.98E-02 -2.56E-02 -2.28E-02 1.05E-03 -1.99E-02 -2.57E-02 -2.32E-02 1.04E-03 -2.03E-02 -2.60E-02 -2.50E-02 4.58E-04 -2.38E-02 -2.63E-02 -1.25E-02 PASS -2.46E-02 4.95E-04 -2.32E-02 -2.59E-02 -8.00E-03 PASS -2.44E-02 5.05E-04 -2.30E-02 -2.58E-02 -8.00E-03 PASS -2.42E-02 5.06E-04 -2.29E-02 -2.56E-02 -8.00E-03 PASS -2.39E-02 5.22E-04 -2.25E-02 -2.54E-02 -8.00E-03 PASS -2.41E-02 5.10E-04 -2.27E-02 -2.55E-02 -8.00E-03 PASS -2.43E-02 4.86E-04 -2.29E-02 -2.56E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 534 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (+KTL) Un-Biased Specification MAX Ps90%/90% (+KTL) Biased Positive Short-Circuit Current @ 5V #4 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.264. Plot of Positive Short-Circuit Current @ 5V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 535 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.264. Raw data for Positive Short-Circuit Current @ 5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @ 5V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MAX Status 24 hr Anneal 168 hr Anneal 0 -2.38E-02 -2.53E-02 -2.47E-02 -2.45E-02 -2.42E-02 -2.39E-02 -2.51E-02 -2.49E-02 -2.49E-02 -2.46E-02 -2.45E-02 10 -2.32E-02 -2.47E-02 -2.41E-02 -2.38E-02 -2.35E-02 -2.36E-02 -2.46E-02 -2.46E-02 -2.43E-02 -2.43E-02 -2.44E-02 20 -2.28E-02 -2.44E-02 -2.39E-02 -2.35E-02 -2.32E-02 -2.33E-02 -2.44E-02 -2.44E-02 -2.40E-02 -2.41E-02 -2.44E-02 30 -2.26E-02 -2.42E-02 -2.37E-02 -2.34E-02 -2.30E-02 -2.32E-02 -2.43E-02 -2.43E-02 -2.38E-02 -2.40E-02 -2.45E-02 50 -2.23E-02 -2.39E-02 -2.34E-02 -2.30E-02 -2.27E-02 -2.29E-02 -2.40E-02 -2.41E-02 -2.35E-02 -2.37E-02 -2.45E-02 60 -2.24E-02 -2.40E-02 -2.35E-02 -2.31E-02 -2.27E-02 -2.30E-02 -2.41E-02 -2.42E-02 -2.36E-02 -2.38E-02 -2.45E-02 70 -2.27E-02 -2.43E-02 -2.38E-02 -2.35E-02 -2.31E-02 -2.32E-02 -2.43E-02 -2.43E-02 -2.38E-02 -2.40E-02 -2.45E-02 -2.45E-02 5.70E-04 -2.29E-02 -2.61E-02 -2.38E-02 5.77E-04 -2.23E-02 -2.54E-02 -2.35E-02 6.08E-04 -2.19E-02 -2.52E-02 -2.34E-02 6.11E-04 -2.17E-02 -2.51E-02 -2.30E-02 6.38E-04 -2.13E-02 -2.48E-02 -2.31E-02 6.31E-04 -2.14E-02 -2.49E-02 -2.35E-02 6.30E-04 -2.17E-02 -2.52E-02 -2.47E-02 4.45E-04 -2.35E-02 -2.59E-02 -1.25E-02 PASS -2.43E-02 4.25E-04 -2.31E-02 -2.54E-02 -8.00E-03 PASS -2.41E-02 4.39E-04 -2.28E-02 -2.53E-02 -8.00E-03 PASS -2.39E-02 4.44E-04 -2.27E-02 -2.51E-02 -8.00E-03 PASS -2.36E-02 4.60E-04 -2.24E-02 -2.49E-02 -8.00E-03 PASS -2.37E-02 4.51E-04 -2.25E-02 -2.50E-02 -8.00E-03 PASS -2.39E-02 4.43E-04 -2.27E-02 -2.51E-02 -8.00E-03 PASS An ISO 9001:2000 Certified Company 536 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 5V #1 (A) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.265. Plot of Negative Short-Circuit Current @ 5V #1 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 537 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.265. Raw data for Negative Short-Circuit Current @ 5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 5V #1 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.79E-02 4.95E-02 4.94E-02 5.03E-02 4.95E-02 4.82E-02 4.94E-02 4.89E-02 4.94E-02 4.86E-02 4.84E-02 10 4.77E-02 4.93E-02 4.93E-02 5.01E-02 4.94E-02 4.82E-02 4.97E-02 4.90E-02 4.98E-02 4.88E-02 4.87E-02 20 4.75E-02 4.92E-02 4.92E-02 5.00E-02 4.93E-02 4.82E-02 4.95E-02 4.89E-02 4.97E-02 4.87E-02 4.87E-02 30 4.73E-02 4.89E-02 4.88E-02 4.96E-02 4.89E-02 4.80E-02 4.94E-02 4.88E-02 4.94E-02 4.86E-02 4.85E-02 50 4.69E-02 4.87E-02 4.86E-02 4.94E-02 4.87E-02 4.78E-02 4.92E-02 4.86E-02 4.93E-02 4.85E-02 4.84E-02 60 4.68E-02 4.84E-02 4.84E-02 4.92E-02 4.86E-02 4.77E-02 4.90E-02 4.84E-02 4.90E-02 4.82E-02 4.83E-02 70 4.75E-02 4.91E-02 4.90E-02 4.98E-02 4.90E-02 4.80E-02 4.93E-02 4.87E-02 4.94E-02 4.85E-02 4.84E-02 4.93E-02 8.45E-04 5.16E-02 4.70E-02 4.92E-02 8.97E-04 5.16E-02 4.67E-02 4.90E-02 9.18E-04 5.16E-02 4.65E-02 4.87E-02 8.72E-04 5.11E-02 4.63E-02 4.85E-02 9.11E-04 5.10E-02 4.60E-02 4.83E-02 8.84E-04 5.07E-02 4.59E-02 4.89E-02 8.47E-04 5.12E-02 4.66E-02 4.89E-02 5.34E-04 5.04E-02 4.74E-02 1.25E-02 PASS 4.91E-02 6.46E-04 5.09E-02 4.73E-02 8.00E-03 PASS 4.90E-02 6.09E-04 5.07E-02 4.73E-02 8.00E-03 PASS 4.88E-02 6.21E-04 5.05E-02 4.71E-02 8.00E-03 PASS 4.87E-02 5.91E-04 5.03E-02 4.70E-02 8.00E-03 PASS 4.85E-02 5.81E-04 5.01E-02 4.69E-02 8.00E-03 PASS 4.88E-02 6.03E-04 5.04E-02 4.71E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 538 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 5V #2 (A) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.266. Plot of Negative Short-Circuit Current @ 5V #2 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 539 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.266. Raw data for Negative Short-Circuit Current @ 5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 5V #2 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.84E-02 4.79E-02 5.05E-02 4.78E-02 4.84E-02 4.94E-02 4.88E-02 4.90E-02 4.89E-02 4.86E-02 4.89E-02 10 4.81E-02 4.77E-02 5.03E-02 4.77E-02 4.83E-02 4.95E-02 4.91E-02 4.92E-02 4.92E-02 4.88E-02 4.92E-02 20 4.80E-02 4.76E-02 5.01E-02 4.76E-02 4.82E-02 4.95E-02 4.89E-02 4.91E-02 4.91E-02 4.87E-02 4.93E-02 30 4.77E-02 4.74E-02 4.99E-02 4.73E-02 4.78E-02 4.93E-02 4.88E-02 4.89E-02 4.89E-02 4.86E-02 4.90E-02 50 4.74E-02 4.71E-02 4.95E-02 4.70E-02 4.77E-02 4.92E-02 4.86E-02 4.87E-02 4.87E-02 4.84E-02 4.90E-02 60 4.72E-02 4.69E-02 4.94E-02 4.69E-02 4.75E-02 4.89E-02 4.84E-02 4.86E-02 4.86E-02 4.82E-02 4.89E-02 70 4.80E-02 4.75E-02 5.00E-02 4.74E-02 4.80E-02 4.93E-02 4.87E-02 4.89E-02 4.88E-02 4.85E-02 4.91E-02 4.86E-02 1.08E-03 5.16E-02 4.57E-02 4.84E-02 1.06E-03 5.13E-02 4.55E-02 4.83E-02 1.05E-03 5.12E-02 4.54E-02 4.80E-02 1.07E-03 5.09E-02 4.51E-02 4.77E-02 1.04E-03 5.06E-02 4.49E-02 4.76E-02 1.06E-03 5.05E-02 4.47E-02 4.82E-02 1.06E-03 5.11E-02 4.53E-02 4.89E-02 3.15E-04 4.98E-02 4.81E-02 1.25E-02 PASS 4.91E-02 2.63E-04 4.99E-02 4.84E-02 8.00E-03 PASS 4.91E-02 3.02E-04 4.99E-02 4.82E-02 8.00E-03 PASS 4.89E-02 2.66E-04 4.96E-02 4.82E-02 8.00E-03 PASS 4.87E-02 2.77E-04 4.95E-02 4.79E-02 8.00E-03 PASS 4.85E-02 2.63E-04 4.93E-02 4.78E-02 8.00E-03 PASS 4.88E-02 2.81E-04 4.96E-02 4.81E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 540 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 5V #3 (A) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.267. Plot of Negative Short-Circuit Current @ 5V #3 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 541 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.267. Raw data for Negative Short-Circuit Current @ 5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 5V #3 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.90E-02 4.83E-02 5.09E-02 4.83E-02 4.89E-02 4.97E-02 4.95E-02 4.95E-02 4.94E-02 4.92E-02 4.95E-02 10 4.87E-02 4.81E-02 5.07E-02 4.82E-02 4.88E-02 4.98E-02 4.98E-02 4.97E-02 4.97E-02 4.94E-02 4.98E-02 20 4.85E-02 4.80E-02 5.05E-02 4.81E-02 4.87E-02 4.98E-02 4.97E-02 4.96E-02 4.95E-02 4.93E-02 4.98E-02 30 4.82E-02 4.77E-02 5.03E-02 4.78E-02 4.83E-02 4.96E-02 4.94E-02 4.94E-02 4.94E-02 4.92E-02 4.96E-02 50 4.78E-02 4.75E-02 4.99E-02 4.76E-02 4.81E-02 4.94E-02 4.93E-02 4.92E-02 4.92E-02 4.91E-02 4.96E-02 60 4.77E-02 4.73E-02 4.98E-02 4.74E-02 4.80E-02 4.93E-02 4.91E-02 4.90E-02 4.90E-02 4.88E-02 4.95E-02 70 4.84E-02 4.78E-02 5.04E-02 4.80E-02 4.84E-02 4.95E-02 4.94E-02 4.93E-02 4.94E-02 4.91E-02 4.97E-02 4.91E-02 1.04E-03 5.19E-02 4.62E-02 4.89E-02 1.03E-03 5.17E-02 4.60E-02 4.87E-02 1.03E-03 5.16E-02 4.59E-02 4.85E-02 1.04E-03 5.13E-02 4.56E-02 4.82E-02 9.97E-04 5.09E-02 4.54E-02 4.80E-02 1.01E-03 5.08E-02 4.52E-02 4.86E-02 1.03E-03 5.14E-02 4.58E-02 4.95E-02 1.99E-04 5.00E-02 4.89E-02 1.25E-02 PASS 4.97E-02 1.49E-04 5.01E-02 4.92E-02 8.00E-03 PASS 4.96E-02 1.79E-04 5.01E-02 4.91E-02 8.00E-03 PASS 4.94E-02 1.67E-04 4.99E-02 4.89E-02 8.00E-03 PASS 4.92E-02 1.36E-04 4.96E-02 4.88E-02 8.00E-03 PASS 4.91E-02 1.79E-04 4.96E-02 4.86E-02 8.00E-03 PASS 4.93E-02 1.63E-04 4.98E-02 4.89E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 542 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Average Biased Average Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Ps90%/90% (-KTL) Biased Negative Short-Circuit Current @ 5V #4 (A) 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 10 20 30 40 Total Dose (krad(Si)) 50 60 24-hr Anneal 70 168-hr Anneal Figure 5.268. Plot of Negative Short-Circuit Current @ 5V #4 (A) versus total dose. The data show no significant change with radiation. The solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2000 Certified Company 543 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Table 5.268. Raw data for Negative Short-Circuit Current @ 5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @ 5V #4 (A) Device 866 867 868 869 870 871 872 873 874 876 877 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Un-Biased Statistics Average Un-Biased Std Dev Un-Biased Ps90%/90% (+KTL) Un-Biased Ps90%/90% (-KTL) Un-Biased Specification MIN Status 24 hr Anneal 168 hr Anneal 0 4.72E-02 4.87E-02 4.87E-02 4.92E-02 4.86E-02 4.74E-02 4.86E-02 4.81E-02 4.87E-02 4.76E-02 4.76E-02 10 4.69E-02 4.86E-02 4.86E-02 4.90E-02 4.84E-02 4.75E-02 4.89E-02 4.82E-02 4.89E-02 4.78E-02 4.78E-02 20 4.67E-02 4.84E-02 4.84E-02 4.89E-02 4.84E-02 4.74E-02 4.88E-02 4.82E-02 4.88E-02 4.77E-02 4.78E-02 30 4.65E-02 4.82E-02 4.81E-02 4.86E-02 4.81E-02 4.72E-02 4.86E-02 4.79E-02 4.87E-02 4.76E-02 4.77E-02 50 4.61E-02 4.78E-02 4.78E-02 4.83E-02 4.78E-02 4.70E-02 4.84E-02 4.78E-02 4.85E-02 4.75E-02 4.77E-02 60 4.60E-02 4.77E-02 4.77E-02 4.81E-02 4.77E-02 4.69E-02 4.82E-02 4.76E-02 4.83E-02 4.72E-02 4.76E-02 70 4.67E-02 4.83E-02 4.83E-02 4.87E-02 4.82E-02 4.72E-02 4.86E-02 4.80E-02 4.87E-02 4.75E-02 4.77E-02 4.85E-02 7.51E-04 5.05E-02 4.64E-02 4.83E-02 8.24E-04 5.05E-02 4.60E-02 4.82E-02 8.33E-04 5.05E-02 4.59E-02 4.79E-02 8.10E-04 5.01E-02 4.57E-02 4.76E-02 8.38E-04 4.99E-02 4.53E-02 4.74E-02 8.21E-04 4.97E-02 4.52E-02 4.80E-02 7.86E-04 5.02E-02 4.59E-02 4.81E-02 5.72E-04 4.96E-02 4.65E-02 1.25E-02 PASS 4.83E-02 6.41E-04 5.00E-02 4.65E-02 8.00E-03 PASS 4.82E-02 6.32E-04 4.99E-02 4.65E-02 8.00E-03 PASS 4.80E-02 6.23E-04 4.97E-02 4.63E-02 8.00E-03 PASS 4.79E-02 6.15E-04 4.95E-02 4.62E-02 8.00E-03 PASS 4.77E-02 6.19E-04 4.94E-02 4.60E-02 8.00E-03 PASS 4.80E-02 6.48E-04 4.97E-02 4.62E-02 8.00E-03 PASS An ISO 9001:2000 Certified Company 544 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The low dose rate total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. For the low dose rate ELDRS testing described in this report, the devices were placed approximately 2-meters from the Co-60 rods to achieve the required 10mrad(Si)/s dose rate. Samples of the RH1499MW quad operational amplifier described in this report were irradiated biased with a split 15V supply and unbiased (all leads tied to ground). The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with a pre-rad baseline reading as well as incremental readings at 10, 20, and 30krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. In addition, all units-under-test received a 24hr room temperature and168hr 100°C anneal, using the same bias conditions as the radiation exposure. The parametric data was obtained as “read and record” and all the raw data plus an attributes summary were presented in this report. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used was 2.742 per MIL HDBK 814 using onesided tolerance limits of 90/90 and a 5-piece sample size. Note that the following criteria was used to determine the outcome of the testing: following the radiation exposure each parameter had to pass the specification value and the average value for the ten-piece sample must pass the specification value when the KTL limits are applied. If these conditions were not both satisfied following the radiation exposure, then the lot would be logged as an RLAT failure. Using the conditions stated above, the RH1499MW devices passed the ELDRS test to 30krad(Si) but failed at 50krad(Si) due to degradation of the output voltage swing and short circuit current for the single-sided 3V supply condition and power supply rejection ratio at the single-sided 2.2V to 12V supply range. Most measured parameters showed no significant degradation with radiation and all parameters passed to 50krad(Si) when tested using the 15V split supply condition. An ISO 9001:2000 Certified Company 545 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of device-under-test to show part markings An ISO 9001:2000 Certified Company 546 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: TID Bias Connections Biased Samples: Pin Function Connection / Bias 1 OUT A To Pin 2 via 5kΩ & 40pF, in Parallel 2 -INPUT A To Pin 1 via 5kΩ & 40pF, in Parallel 3 +INPUT A To 8V via 5kΩ Resistor 4 V+ To +15V using 0.1μF Decoupling 5 +INPUT B To 8V via 5kΩ Resistor 6 -INPUT B To Pin 7 via 5kΩ & 40pF, in Parallel 7 OUT B To Pin 6 via 5kΩ & 40pF, in Parallel 8 OUT C To Pin 9 via 5kΩ & 40pF, in Parallel 9 -INPUT C To Pin 8 via 5kΩ & 40pF, in Parallel 10 +INPUT C To 8V via 5kΩ Resistor 11 V- To -15V using 0.1μF Decoupling 12 +INPUT D To 8V via 10kΩ Resistor 13 -INPUT D To Pin 14 via 5kΩ & 40pF, in Parallel 14 OUT D To Pin 13 via 5kΩ & 40pF, in Parallel An ISO 9001:2000 Certified Company 547 ELDRS Report 08-133 090622 R1.2 Unbiased Samples: Pin Function Connection / Bias 1 OUT A GND 2 -INPUT A GND 3 +INPUT A GND 4 V+ GND 5 +INPUT B GND 6 -INPUT B GND 7 OUT B GND 8 OUT C GND 9 -INPUT C GND 10 +INPUT C GND 11 V- GND 12 +INPUT D GND 13 -INPUT D GND 14 OUT D GND An ISO 9001:2000 Certified Company 548 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION, RH1499M Datasheet. Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY CORPORATION, RH1499M Datasheet. An ISO 9001:2000 Certified Company 549 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1499 BGS-061114 DUT board. The measured parameters and test conditions are shown in Tables C.1 (VS=±15V), C.2 (VS=3V), and C.3 (VS=5V). A listing of the measurement precision/resolution for each parameter is shown in Tables C.4 (VS=±15V), C.5 (VS=3V), and C.6 (VS=5V). The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS-2020. To generate the precision/resolution shown in Table C.4 through C.6, one of the units-under-test was tested repetitively (a total of 10-times with reinsertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Open Loop Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2000 Certified Company 550 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.1. Measured parameters and test conditions for VS=±15V. TEST DESCRIPTION Positive Supply Current Negative Supply Current Input Offset Voltage (Op Amp 1-4) Input Offset Current (Op Amp 1-4) + Input Bias Current (Op Amp 1-4) - Input Bias Current (Op Amp 1-4) Input Offset Voltage (Op Amp 1-4) Input Offset Current (Op Amp 1-4) + Input Bias Current (Op Amp 1-4) - Input Bias Current (Op Amp 1-4) Input Offset Voltage (Op Amp 1-4) Input Offset Current (Op Amp 1-4) + Input Bias Current (Op Amp 1-4) - Input Bias Current (Op Amp 1-4) Large Signal Voltage Gain (Op Amp 1-4) Large Signal Voltage Gain (Op Amp 1-4) CMRR (Op Amp 1-4) CMRR Matching 1-4 CMRR Matching 2-3 PSRR (Op Amp 1-4) PSRR Matching 1-4 PSRR Matching 2-3 Output Voltage Swing High (Op Amp 1-4) Output Voltage Swing High (Op Amp 1-4) Output Voltage Swing High (Op Amp 1-4) Output Voltage Swing Low (Op Amp 1-4) Output Voltage Swing Low (Op Amp 1-4) Output Voltage Swing Low (Op Amp 1-4) +VS Short-Circuit Current (Op Amp 1-4) -VS Short-Circuit Current (Op Amp 1-4) TEST CONDITIONS V+=15V and V-=-15V V+=15V and V-=-15V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=0V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=15V V+=15V, V-=-15V and VCM=-15V V+=15V, V-=-15V and VCM=-15V V+=15V, V-=-15V and VCM=-15V V+=15V, V-=-15V and VCM=-15V RL = 10kΩ, VO = ±14.5V RL = 2kΩ, VO = ±10V VS=±15V, VCM=±15V VS=±15V, VCM=±15V VS=±15V, VCM=±15V VS=±2V to VS=±16V VS=±2V to VS=±16V VS=±2V to VS=±16V VS=±15V, No Load VS=±15V, ISOURCE=1mA VS=±15V, ISOURCE =10mA VS=±15V, No Load VS=±15V, ISINK=1mA VS=±15V, ISINK=10mA VS=±15V VS=±15V An ISO 9001:2000 Certified Company 551 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.2. Measured parameters and test conditions for VS=3V. TEST DESCRIPTION TEST CONDITIONS Positive Supply Current V+=3V and V-=0V Negative Supply Current V+=3V and V-=0V Input Offset Voltage (Op Amp 1-4) V+=3V, V-=0V and VCM=0V Input Offset Current (Op Amp 1-4) V+=3V, V-=0V and VCM=0V + Input Bias Current (Op Amp 1-4) V+=3V, V-=0V and VCM=0V - Input Bias Current (Op Amp 1-4) V+=3V, V-=0V and VCM=0V Input Offset Voltage (Op Amp 1-4) V+=3V, V-=0V and VCM=3V Input Offset Current (Op Amp 1-4) V+=3V, V-=0V and VCM=3V + Input Bias Current (Op Amp 1-4) V+=3V, V-=0V and VCM=3V - Input Bias Current (Op Amp 1-4) V+=3V, V-=0V and VCM=3V Large Signal Voltage Gain (Op Amp 1-4) RL = 10kΩ, VO=75mV to 2.8V CMRR (Op Amp 1-4) VS=3V, VCM=0-3V CMRR Matching 1-4 VS=3V, VCM=0-3V CMRR Matching 2-3 VS=3V, VCM=0-3V Output Voltage Swing High (Op Amp 1-4) VS=3V, No Load Output Voltage Swing High (Op Amp 1-4) VS=3V, ISOURCE=1mA Output Voltage Swing High (Op Amp 1-4) VS=3V, ISOURCE=2.5mA Output Voltage Swing Low (Op Amp 1-4) VS=3V, No Load Output Voltage Swing Low (Op Amp 1-4) VS=3V, ISINK=1mA Output Voltage Swing Low (Op Amp 1-4) VS=3V, ISINK=2.5mA +VS Short-Circuit Current (Op Amp 1-4) VS=3V -VS Short-Circuit Current (Op Amp 1-4) VS=3V An ISO 9001:2000 Certified Company 552 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.3. Measured parameters and test conditions for VS=5V. TEST DESCRIPTION TEST CONDITIONS Positive Supply Current V+=5V and V-=0V Negative Supply Current V+=5V and V-=0V Input Offset Voltage (Op Amp 1-4) V+=5V, V-=0V and VCM=0V Input Offset Current (Op Amp 1-4) V+=5V, V-=0V and VCM=0V + Input Bias Current (Op Amp 1-4) V+=5V, V-=0V and VCM=0V - Input Bias Current (Op Amp 1-4) V+=5V, V-=0V and VCM=0V Input Offset Voltage (Op Amp 1-4) V+=5V, V-=0V and VCM=5V Input Offset Current (Op Amp 1-4) V+=5V, V-=0V and VCM=5V + Input Bias Current (Op Amp 1-4) V+=5V, V-=0V and VCM=5V - Input Bias Current (Op Amp 1-4) V+=5V, V-=0V and VCM=5V Large Signal Voltage Gain (Op Amp 1-4) RL = 10kΩ, VO=75mV to 4.8V CMRR (Op Amp 1-4) VS=5V, VCM=0-5V CMRR Matching 1-4 VS=5V, VCM=0-5V CMRR Matching 2-3 VS=5V, VCM=0-5V PSRR (Op Amp 1-4) VS=2.2V to VS=12V PSRR Matching 1-4 VS=2.2V to VS=12V PSRR Matching 2-3 VS=2.2V to VS=12V Output Voltage Swing High (Op Amp 1-4) VS=5V, No Load Output Voltage Swing High (Op Amp 1-4) VS=5V, ISOURCE=1mA Output Voltage Swing High (Op Amp 1-4) VS=5V, ISOURCE=2.5mA Output Voltage Swing Low (Op Amp 1-4) VS=5V, No Load Output Voltage Swing Low (Op Amp 1-4) VS=5V, ISINK=1mA Output Voltage Swing Low (Op Amp 1-4) VS=5V, ISINK=2.5mA +VS Short-Circuit Current (Op Amp 1-4) VS=5V -VS Short-Circuit Current (Op Amp 1-4) VS=5V An ISO 9001:2000 Certified Company 553 ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.4. Measured parameters, pre-irradiation specifications and measurement resolutions for VS=±15V. Pre-Irradiation Measurement Specification Resolution/Precision Measured Parameter Positive Supply Current Negative Supply Current Input Offset Voltage Input Offset Current + Input Bias Current - Input Bias Current Large Signal Voltage Gain (10kΩ Load) Large Signal Voltage Gain (2kΩ Load) Common Mode Rejection Ratio Common Mode Rejection Ratio Matching Power Supply Rejection Ratio Power Supply Rejection Ratio Matching Output Voltage Swing High (No Load) Output Voltage Swing High (ISOURCE=1mA) Output Voltage Swing High (ISOURCE=10mA) Output Voltage Swing Low (No Load) Output Voltage Swing Low (ISINK=1mA) Output Voltage Swing Low (ISINK=10mA) +VS Short Circuit Current -VS Short Circuit Current 10mA -10mA ±800μV ±70nA ±715nA ±715nA 1000V/mV 500V/mV 90dB 84dB 90dB 83dB 10mV 150mV 800mV 30mV 100mV 500mV ±15mA ±15mA An ISO 9001:2000 Certified Company 554 ± 1.08E-04A ± 1.05E-04A ± 1.91E-05V ± 8.92E-10A ± 6.20E-09A ± 5.65E-09A ± 7.10E+02V/mV ± 1.10E+02V/mV ± 3.84E+00dB ± 1.83E-01dB ± 4.11E-01dB ± 2.53E-00dB ± 1.82E-04V ± 6.24E-04V ± 3.00E-03V ± 3.72E-04V ± 4.74E-04V ± 1.85E-03V ± 5.70E-04A ± 8.17E-04A ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.5. Measured parameters, pre-irradiation specifications and measurement resolutions for VS=3V. Pre-Irradiation Measurement Specification Resolution/Precision Measured Parameter Positive Supply Current Negative Supply Current Input Offset Voltage Input Offset Current + Input Bias Current - Input Bias Current Large Signal Voltage Gain (10kΩ Load) Common Mode Rejection Ratio Common Mode Rejection Ratio Matching Output Voltage Swing High (No Load) Output Voltage Swing High (ISOURCE=1mA) Output Voltage Swing High (ISOURCE=2.5mA) Output Voltage Swing Low (No Load) Output Voltage Swing Low (ISINK=1mA) Output Voltage Swing Low (ISINK=2.5mA) +VS Short Circuit Current -VS Short Circuit Current 8.8mA -8.8mA ±800μV ±65nA ±650nA ±650nA 500V/mV 72dB 70dB 10mV 150mV 250mV 30mV 100mV 200mV ±12mA ±12mA An ISO 9001:2000 Certified Company 555 ± 1.39E-05A ± 2.13E-05A ± 4.53E-06V ± 6.63E-10A ± 4.87E-09A ± 5.59E-09A ± 2.16E+02V/mV ± 3.65E-01dB ± 8.62E-02dB ± 1.59E-04V ± 1.95E-04V ± 4.07E-04V ± 2.04E-04V ± 1.91E-04V ± 3.99E-04V ± 1.81E-05A ± 7.36E-05A ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.6. Measured parameters, pre-irradiation specifications and measurement resolutions for VS=5V. Pre-Irradiation Measurement Specification Resolution/Precision Measured Parameter Positive Supply Current Negative Supply Current Input Offset Voltage Input Offset Current + Input Bias Current - Input Bias Current Large Signal Voltage Gain (10kΩ Load) Common Mode Rejection Ratio Common Mode Rejection Ratio Matching Power Supply Rejection Ratio Power Supply Rejection Ratio Matching Output Voltage Swing High (No Load) Output Voltage Swing High (ISOURCE=1mA) Output Voltage Swing High (ISOURCE=2.5mA) Output Voltage Swing Low (No Load) Output Voltage Swing Low (ISINK=1mA) Output Voltage Swing Low (ISINK=2.5mA) +VS Short Circuit Current -VS Short Circuit Current 8.8mA -8.8mA ±800μV ±65nA ±650nA ±650nA 600V/mV 76dB 75dB 88dB 82dB 10mV 150mV 250mV 30mV 100mV 200mV ±12.5mA ±12.5mA An ISO 9001:2000 Certified Company 556 ± 3.51E-05A ± 3.54E-05A ± 7.82E-06V ± 5.95E-10A ± 6.87E-09A ± 7.29E-09A ± 7.14E+02V/mV ± 1.04E-00dB ± 1.62E-01dB ± 4.84E-00dB ± 1.76E-00dB ± 1.76E-04V ± 3.07E-04V ± 4.42E-04V ± 1.75E-04V ± 1.84E-04V ± 4.18E-04V ± 4.44E-05A ±1.40E-04A ELDRS Report 08-133 090622 R1.2 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix D: List of Figures used in Section 5 (ELDRS Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current (A) Negative Supply Current (A) Input Offset Voltage @ +/- 15V, VCM= 0 V #1 (V) Input Offset Voltage @ +/- 15V, VCM= 0 V #2 (V) Input Offset Voltage @ +/- 15V, VCM= 0 V #3 (V) Input Offset Voltage @ +/- 15V, VCM= 0 V #4 (V) Input Offset Current @ +/- 15V, VCM= 0 V #1 (A) Input Offset Current @ +/- 15V, VCM= 0 V #2 (A) Input Offset Current @ +/- 15V, VCM= 0 V #3 (A) Input Offset Current @ +/- 15V, VCM= 0 V #4 (A) Positive Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Positive Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Positive Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) Positive Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) Negative Input Bias Current @ +/- 15V, VCM= 0 V #1 (A) Negative Input Bias Current @ +/- 15V, VCM= 0 V #2 (A) Negative Input Bias Current @ +/- 15V, VCM= 0 V #3 (A) Negative Input Bias Current @ +/- 15V, VCM= 0 V #4 (A) Input Offset Voltage @ +/- 15V, VCM= 15 V #1 (V) Input Offset Voltage @ +/- 15V, VCM= 15 V #2 (V) Input Offset Voltage @ +/- 15V, VCM= 15 V #3 (V) Input Offset Voltage @ +/- 15V, VCM= 15 V #4 (V) Input Offset Current @ +/- 15V, VCM= 15 V #1 (A) Input Offset Current @ +/- 15V, VCM= 15 V #2 (A) Input Offset Current @ +/- 15V, VCM= 15 V #3 (A) Input Offset Current @ +/- 15V, VCM= 15 V #4 (A) Positive Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Positive Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Positive Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) Positive Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) Negative Input Bias Current @ +/- 15V, VCM= 15 V #1 (A) Negative Input Bias Current @ +/- 15V, VCM= 15 V #2 (A) Negative Input Bias Current @ +/- 15V, VCM= 15 V #3 (A) Negative Input Bias Current @ +/- 15V, VCM= 15 V #4 (A) Input Offset Voltage @ +/- 15V, VCM= -15 V #1 (V) Input Offset Voltage @ +/- 15V, VCM= -15 V #2 (V) Input Offset Voltage @ +/- 15V, VCM= -15 V #3 (V) Input Offset Voltage @ +/- 15V, VCM= -15 V #4 (V) Input Offset Current @ +/- 15V, VCM= -15 V #1 (A) An ISO 9001:2000 Certified Company 557 ELDRS Report 08-133 090622 R1.2 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 5.63 5.64 5.65 5.66 5.67 5.68 5.69 5.70 5.71 5.72 5.73 5.74 5.75 5.76 5.77 5.78 5.79 5.80 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Input Offset Current @ +/- 15V, VCM= -15 V #2 (A) Input Offset Current @ +/- 15V, VCM= -15 V #3 (A) Input Offset Current @ +/- 15V, VCM= -15 V #4 (A) Positive Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Positive Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Positive Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) Positive Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) Negative Input Bias Current @ +/- 15V, VCM= -15 V #1 (A) Negative Input Bias Current @ +/- 15V, VCM= -15 V #2 (A) Negative Input Bias Current @ +/- 15V, VCM= -15 V #3 (A) Negative Input Bias Current @ +/- 15V, VCM= -15 V #4 (A) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #1 (V/mV) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #2 (V/mV) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #3 (V/mV) Large Signal Voltage Gain RL= 10k, VO=+/- 14.5 V #4 (V/mV) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #1 (V/mV) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #2 (V/mV) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #3 (V/mV) Large Signal Voltage Gain RL= 2k, VO=+/- 10 V #4 (V/mV) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #1 (dB) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #2 (dB) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #3 (dB) Common Mode Rejection Ratio @ +/- 15 V, VCM=+/- 15 V #4 (dB) Common Mode Rejection Ratio Matching 1-4 @ +/- 15 V, VCM=+/- 15 V (dB) Common Mode Rejection Ratio Matching 2-3 @ +/- 15 V, VCM=+/- 15 V (dB) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #1 (dB) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #2 (dB) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #3 (dB) Power Supply Rejection Ratio @ +/- 2 V to +/- 16 V #4 (dB) Power Supply Rejection Ratio Matching 1-4 @ +/- 2 V to +/- 16 V (dB) Power Supply Rejection Ratio Matching 2-3 @ +/- 2 V to +/- 16 V (dB) Output Voltage Swing High IL= 0 mA @ +/- 15 V #1 (V) Output Voltage Swing High IL= 0 mA @ +/- 15 V #2 (V) Output Voltage Swing High IL= 0 mA @ +/- 15 V #3 (V) Output Voltage Swing High IL= 0 mA @ +/- 15 V #4 (V) Output Voltage Swing High IL= 1 mA @ +/- 15 V #1 (V) Output Voltage Swing High IL= 1 mA @ +/- 15 V #2 (V) Output Voltage Swing High IL= 1 mA @ +/- 15 V #3 (V) Output Voltage Swing High IL= 1 mA @ +/- 15 V #4 (V) Output Voltage Swing High IL= 10 mA @ +/- 15 V #1 (V) Output Voltage Swing High IL= 10 mA @ +/- 15 V #2 (V) An ISO 9001:2000 Certified Company 558 ELDRS Report 08-133 090622 R1.2 5.81 5.82 5.83 5.84 5.85 5.86 5.87 5.88 5.89 5.90 5.91 5.92 5.93 5.94 5.95 5.96 5.97 5.98 5.99 5.100 5.101 5.102 5.103 5.104 5.105 5.106 5.107 5.108 5.109 5.110 5.111 5.112 5.113 5.114 5.115 5.116 5.117 5.118 5.119 5.120 5.121 Output Voltage Swing High IL= 10 mA @ +/- 15 V #3 (V) Output Voltage Swing High IL= 10 mA @ +/- 15 V #4 (V) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #1 (V) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #2 (V) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #3 (V) Output Voltage Swing Low IL= 0 mA @ +/- 15 V #4 (V) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #1 (V) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #2 (V) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #3 (V) Output Voltage Swing Low IL= 1 mA @ +/- 15 V #4 (V) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #1 (V) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #2 (V) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #3 (V) Output Voltage Swing Low IL= 10 mA @ +/- 15 V #4 (V) Positive Short-Circuit Current @ +/- 15 V #1 (A) Positive Short-Circuit Current @ +/- 15 V #2 (A) Positive Short-Circuit Current @ +/- 15 V #3 (A) Positive Short-Circuit Current @ +/- 15 V #4 (A) Negative Short-Circuit Current @ +/- 15 V #1 (A) Negative Short-Circuit Current @ +/- 15 V #2 (A) Negative Short-Circuit Current @ +/- 15 V #3 (A) Negative Short-Circuit Current @ +/- 15 V #4 (A) Positive Supply Current @ 3V (A) Negative Supply Current @ 3V (A) Input Offset Voltage @ 3V, VCM=0V #1 (V) Input Offset Voltage @ 3V, VCM=0V #2 (V) Input Offset Voltage @ 3V, VCM=0V #3 (V) Input Offset Voltage @ 3V, VCM=0V #4 (V) Input Offset Current @ 3V, VCM=0V #1 (A) Input Offset Current @ 3V, VCM=0V #2 (A) Input Offset Current @ 3V, VCM=0V #3 (A) Input Offset Current @ 3V, VCM=0V #4 (A) Positive Input Bias Current @ 3V, VCM=0V #1 (A) Positive Input Bias Current @ 3V, VCM=0V #2 (A) Positive Input Bias Current @ 3V, VCM=0V #3 (A) Positive Input Bias Current @ 3V, VCM=0V #4 (A) Negative Input Bias Current @ 3V, VCM=0V #1 (A) Negative Input Bias Current @ 3V, VCM=0V #2 (A) Negative Input Bias Current @ 3V, VCM=0V #3 (A) Negative Input Bias Current @ 3V, VCM=0V #4 (A) Input Offset Voltage @ 3V, VCM=3V #1 (V) An ISO 9001:2000 Certified Company 559 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 5.122 5.123 5.124 5.125 5.126 5.127 5.128 5.129 5.130 5.131 5.132 5.133 5.134 5.135 5.136 5.137 5.138 5.139 5.140 5.141 5.142 5.143 5.144 5.145 5.146 5.147 5.148 5.149 5.150 5.151 5.152 5.153 5.154 5.155 5.156 5.157 5.158 5.159 5.160 5.161 5.162 Input Offset Voltage @ 3V, VCM=3V #2 (V) Input Offset Voltage @ 3V, VCM=3V #3 (V) Input Offset Voltage @ 3V, VCM=3V #4 (V) Input Offset Current @ 3V, VCM=3V #1 (A) Input Offset Current @ 3V, VCM=3V #2 (A) Input Offset Current @ 3V, VCM=3V #3 (A) Input Offset Current @ 3V, VCM=3V #4 (A) Positive Input Bias Current @ 3V, VCM=3V #1 (A) Positive Input Bias Current @ 3V, VCM=3V #2 (A) Positive Input Bias Current @ 3V, VCM=3V #3 (A) Positive Input Bias Current @ 3V, VCM=3V #4 (A) Negative Input Bias Current @ 3V, VCM=3V #1 (A) Negative Input Bias Current @ 3V, VCM=3V #2 (A) Negative Input Bias Current @ 3V, VCM=3V #3 (A) Negative Input Bias Current @ 3V, VCM=3V #4 (A) Large Signal Voltage Gain @ 3V #1 (V/mV) Large Signal Voltage Gain @ 3V #2 (V/mV) Large Signal Voltage Gain @ 3V #3 (V/mV) Large Signal Voltage Gain @ 3V #4 (V/mV) Large Signal Voltage Gain @ 3V #1 (dB) Large Signal Voltage Gain @ 3V #2 (dB) Large Signal Voltage Gain @ 3V #3 (dB) Large Signal Voltage Gain @ 3V #4 (dB) Common Mode Rejection Ratio @ 3V #1 (dB) Common Mode Rejection Ratio @ 3V #2 (dB) Common Mode Rejection Ratio @ 3V #3 (dB) Common Mode Rejection Ratio @ 3V #4 (dB) Common Mode Rejection Ratio Matching 1-4 @ 3V (dB) Common Mode Rejection Ratio Matching 2-3 @ 3V (dB) Output Voltage Swing High IL= 0mA @ 3V #1 (V) Output Voltage Swing High IL= 0mA @ 3V #2 (V) Output Voltage Swing High IL= 0mA @ 3V #3 (V) Output Voltage Swing High IL= 0mA @ 3V #4 (V) Output Voltage Swing High IL= 1mA @ 3V #1 (V) Output Voltage Swing High IL= 1mA @ 3V #2 (V) Output Voltage Swing High IL= 1mA @ 3V #3 (V) Output Voltage Swing High IL= 1mA @ 3V #4 (V) Output Voltage Swing High IL= 2.5mA @ 3V #1 (V) Output Voltage Swing High IL= 2.5mA @ 3V #2 (V) Output Voltage Swing High IL= 2.5mA @ 3V #3 (V) Output Voltage Swing High IL= 2.5mA @ 3V #4 (V) An ISO 9001:2000 Certified Company 560 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 5.163 5.164 5.165 5.166 5.167 5.168 5.169 5.170 5.171 5.172 5.173 5.174 5.175 5.176 5.177 5.178 5.179 5.180 5.181 5.182 5.183 5.184 5.185 5.186 5.187 5.188 5.189 5.190 5.191 5.192 5.193 5.194 5.195 5.196 5.197 5.198 5.199 5.200 5.201 5.202 5.203 Output Voltage Swing Low IL= 0mA @ 3V #1 (V) Output Voltage Swing Low IL= 0mA @ 3V #2 (V) Output Voltage Swing Low IL= 0mA @ 3V #3 (V) Output Voltage Swing Low IL= 0mA @ 3V #4 (V) Output Voltage Swing Low IL= 1mA @ 3V #1 (V) Output Voltage Swing Low IL= 1mA @ 3V #2 (V) Output Voltage Swing Low IL= 1mA @ 3V #3 (V) Output Voltage Swing Low IL= 1mA @ 3V #4 (V) Output Voltage Swing Low IL= 2.5mA @ 3V #1 (V) Output Voltage Swing Low IL= 2.5mA @ 3V #2 (V) Output Voltage Swing Low IL= 2.5mA @ 3V #3 (V) Output Voltage Swing Low IL= 2.5mA @ 3V #4 (V) Positive Short-Circuit Current @ 3V #1 (A) Positive Short-Circuit Current @ 3V #2 (A) Positive Short-Circuit Current @ 3V #3 (A) Positive Short-Circuit Current @ 3V #4 (A) Negative Short-Circuit Current @ 3V #1 (A) Negative Short-Circuit Current @ 3V #2 (A) Negative Short-Circuit Current @ 3V #3 (A) Negative Short-Circuit Current @ 3V #4 (A) Positive Supply Current @ 5V (A) Negative Supply Current @ 5V (A) Input Offset Voltage @ 5V, VCM=0V #1 (V) Input Offset Voltage @ 5V, VCM=0V #2 (V) Input Offset Voltage @ 5V, VCM=0V #3 (V) Input Offset Voltage @ 5V, VCM=0V #4 (V) Input Offset Current @ 5V, VCM=0V #1 (A) Input Offset Current @ 5V, VCM=0V #2 (A) Input Offset Current @ 5V, VCM=0V #3 (A) Input Offset Current @ 5V, VCM=0V #4 (A) Positive Input Bias Current @ 5V, VCM=0V #1 (A) Positive Input Bias Current @ 5V, VCM=0V #2 (A) Positive Input Bias Current @ 5V, VCM=0V #3 (A) Positive Input Bias Current @ 5V, VCM=0V #4 (A) Negative Input Bias Current @ 5V, VCM=0V #1 (A) Negative Input Bias Current @ 5V, VCM=0V #2 (A) Negative Input Bias Current @ 5V, VCM=0V #3 (A) Negative Input Bias Current @ 5V, VCM=0V #4 (A) Input Offset Voltage @ 5V, VCM=5V #1 (V) Input Offset Voltage @ 5V, VCM=5V #2 (V) Input Offset Voltage @ 5V, VCM=5V #3 (V) An ISO 9001:2000 Certified Company 561 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 5.204 5.205 5.206 5.207 5.208 5.209 5.210 5.211 5.212 5.213 5.214 5.215 5.216 5.217 5.218 5.219 5.220 5.221 5.222 5.223 5.224 5.225 5.226 5.227 5.228 5.229 5.230 5.231 5.232 5.233 5.234 5.235 5.236 5.237 5.238 5.239 5.240 5.241 5.242 5.243 5.244 Input Offset Voltage @ 5V, VCM=5V #4 (V) Input Offset Current @ 5V, VCM=5V #1 (A) Input Offset Current @ 5V, VCM=5V #2 (A) Input Offset Current @ 5V, VCM=5V #3 (A) Input Offset Current @ 5V, VCM=5V #4 (A) Positive Input Bias Current @ 5V, VCM=5V #1 (A) Positive Input Bias Current @ 5V, VCM=5V #2 (A) Positive Input Bias Current @ 5V, VCM=5V #3 (A) Positive Input Bias Current @ 5V, VCM=5V #4 (A) Negative Input Bias Current @ 5V, VCM=5V #1 (A) Negative Input Bias Current @ 5V, VCM=5V #2 (A) Negative Input Bias Current @ 5V, VCM=5V #3 (A) Negative Input Bias Current @ 5V, VCM=5V #4 (A) Large Signal Voltage Gain @ 5V #1 (V/mV) Large Signal Voltage Gain @ 5V #2 (V/mV) Large Signal Voltage Gain @ 5V #3 (V/mV) Large Signal Voltage Gain @ 5V #4 (V/mV) Large Signal Voltage Gain @ 5V #1 (dB) Large Signal Voltage Gain @ 5V #2 (dB) Large Signal Voltage Gain @ 5V #3 (dB) Large Signal Voltage Gain @ 5V #4 (dB) Common Mode Rejection Ratio @ 5V #1 (dB) Common Mode Rejection Ratio @ 5V #2 (dB) Common Mode Rejection Ratio @ 5V #3 (dB) Common Mode Rejection Ratio @ 5V #4 (dB) Common Mode Rejection Ratio Matching 1-4 @ 5V (dB) Common Mode Rejection Ratio Matching 2-3 @ 5V (dB) Power Supply Rejection Ratio @ 2.2V-12V #1 (dB) Power Supply Rejection Ratio @ 2.2V-12V #2 (dB) Power Supply Rejection Ratio @ 2.2V-12V #3 (dB) Power Supply Rejection Ratio @ 2.2V-12V #4 (dB) Power Supply Rejection Ratio Matching 1-4 @ 2.2V-12V (dB) Power Supply Rejection Ratio Matching 2-3 @ 2.2V-12V (dB) Output Voltage Swing High IL= 0mA @ 5V #1 (V) Output Voltage Swing High IL= 0mA @ 5V #2 (V) Output Voltage Swing High IL= 0mA @ 5V #3 (V) Output Voltage Swing High IL= 0mA @ 5V #4 (V) Output Voltage Swing High IL= 1mA @ 5V #1 (V) Output Voltage Swing High IL= 1mA @ 5V #2 (V) Output Voltage Swing High IL= 1mA @ 5V #3 (V) Output Voltage Swing High IL= 1mA @ 5V #4 (V) An ISO 9001:2000 Certified Company 562 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 ELDRS Report 08-133 090622 R1.2 5.245 5.246 5.247 5.248 5.249 5.250 5.251 5.252 5.253 5.254 5.255 5.256 5.257 5.258 5.259 5.260 5.261 5.262 5.263 5.264 5.265 5.266 5.267 5.268 Output Voltage Swing High IL= 2.5mA @ 5V #1 (V) Output Voltage Swing High IL= 2.5mA @ 5V #2 (V) Output Voltage Swing High IL= 2.5mA @ 5V #3 (V) Output Voltage Swing High IL= 2.5mA @ 5V #4 (V) Output Voltage Swing Low IL= 0mA @ 5V #1 (V) Output Voltage Swing Low IL= 0mA @ 5V #2 (V) Output Voltage Swing Low IL= 0mA @ 5V #3 (V) Output Voltage Swing Low IL= 0mA @ 5V #4 (V) Output Voltage Swing Low IL= 1mA @ 5V #1 (V) Output Voltage Swing Low IL= 1mA @ 5V #2 (V) Output Voltage Swing Low IL= 1mA @ 5V #3 (V) Output Voltage Swing Low IL= 1mA @ 5V #4 (V) Output Voltage Swing Low IL= 2.5mA @ 5V #1 (V) Output Voltage Swing Low IL= 2.5mA @ 5V #2 (V) Output Voltage Swing Low IL= 2.5mA @ 5V #3 (V) Output Voltage Swing Low IL= 2.5mA @ 5V #4 (V) Positive Short-Circuit Current @ 5V #1 (A) Positive Short-Circuit Current @ 5V #2 (A) Positive Short-Circuit Current @ 5V #3 (A) Positive Short-Circuit Current @ 5V #4 (A) Negative Short-Circuit Current @ 5V #1 (A) Negative Short-Circuit Current @ 5V #2 (A) Negative Short-Circuit Current @ 5V #3 (A) Negative Short-Circuit Current @ 5V #4 (A) An ISO 9001:2000 Certified Company 563 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800