RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Radiation Lot Acceptance Testing (RLAT) of the RH1814MW Quad Op Amp for Linear Technology Customer: Linear Technology (PO 56741L) RAD Job Number: 10-326 Part Type Tested: Linear Technology RH1814MW Quad Op Amp Commercial Part Number: RH1814MW Traceability Information: Fab Lot# WF001929, Wafer 6, Assembly Lot# 558858.1. Information obtained from Linear Technology PO#56741L. Date code marking on the package is 1004A, see Appendix A for a photograph of the device and part markings. Quantity of Units: 12 units total, 10 units for biased irradiation and 2 control units. Serial numbers 1245 to 1251, 1261 to 1263 were biased during irradiation. Serial numbers 1264 and 1265 were used as controls. See Appendix B for the radiation bias connection table. Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD. TID Dose Rate and Test Increments: 50-300rad(Si)/s with readings at pre-irradiation, 10, 20, 30, 40, 50, 60, 70, 75, 100, and 200krad(Si). TID Overtest and Post-Irradiation Anneal: No overtest or anneal. TID Test Standard: MIL-STD-883G, Method 1019.7, Condition A TID Electrical Test Conditions: Pre-irradiation, and within one hour following each radiation exposure. Test Programs: RH1814W.SRC Test Hardware: LTS2020 Tester, 2101 Family Board, 0600 Fixture, and RH1814W BGSS-080826 DUT Board. Facility and Radiation Source: Radiation Assured Devices Longmire Laboratories, Colorado Springs, CO using the JLSA 81-24 high dose rate Co60 source. Dosimetry performed by CaF2 TLDs traceable to NIST. RAD’s dosimetry has been audited by DSCC and RAD has been awarded Laboratory Suitability for MIL-STD-750 TM 1019.5. Irradiation and Test Temperature: Ambient room temperature for irradiation and test controlled to 24°C±6°C per MIL-STD-883. RLAT Result: PASSED. The units showed no significant degradation with total dose. All parameters remained within their datasheet specifications to the maximum dose level tested of 200krad(Si) An ISO 9001:2008 and DSCC Certified Company 1 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 1.0. Overview and Background It is well known that total dose ionizing radiation can cause parametric degradation and ultimately functional failure in electronic devices. The damage occurs via electron-hole pair production, transport and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to ensure a worst-case test condition MIL-STD-883 TM1019.7 calls out a dose rate of 50 to 300rad(Si)/s as Condition A and further specifies that the time from the end of an incremental radiation exposure and electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to the beginning of the next incremental radiation step should be 2-hours or less. The work described in this report was performed to meet MIL-STD-883 TM1019.7 Condition A. 2.0. Radiation Test Apparatus The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. For high-dose rate experiments the bias boards are placed in a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required dose rate. The irradiator calibration is maintained by Radiation Assured Devices Longmire Laboratories using thermoluminescent dosimeters (TLDs)) traceable to the National Institute of Standards and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at RAD’s Longmire Laboratory facility. RAD is currently certified by the Defense Supply Center Columbus (DSCC) for Laboratory Suitability under MIL STD 750. Additional details regarding Radiation Assured Devices dosimetry for TM1019 Condition A testing are available in RAD’s report to DSCC entitled: “Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation Assured Devices” An ISO 9001:2008 and DSCC Certified Company 2 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure 2.1. Radiation Assured Devices’ high dose rate Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 120rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet. An ISO 9001:2008 and DSCC Certified Company 3 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 3.0. Radiation Test Conditions The RH1814MW Quad Op Amp described in this final report were irradiated using a split 5V supply that is biased, which has been shown to be the worst-case bias condition for these units. See the TID Bias Table in Appendix B for the full bias circuits. In our opinion, this bias circuit satisfies the requirements of MIL-STD-883G TM1019.7 Section 3.9.3 Bias and Loading Conditions which states “The bias applied to the test devices shall be selected to produce the greatest radiation induced damage or the worst-case damage for the intended application, if known. While maximum voltage is often worst case some bipolar linear device parameters (e.g. input bias current or maximum output load current) exhibit more degradation with 0 V bias.” Note that the determination of pass / fail for this lot is based on the response of the biased units only. The devices were irradiated to a maximum total ionizing dose level of 200krad(Si) with incremental readings at 10, 20, 30, 40, 50, 60, 70, 75 and 100krad(Si). Electrical testing occurred within one hour following the end of each irradiation segment. For intermediate irradiations, the parts were tested and returned to total dose exposure within two hours from the end of the previous radiation increment. The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MIL-STD-883G TM1019.7 Section 3.4 that reads as follows: “Lead/Aluminum (Pb/Al) container. Test specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1) initially, (2) when the source is changed, or (3) when the orientation or configuration of the source, container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g., a TLD) in the device-irradiation container at the approximate test-device position. If it can be demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors due to dose enhancement, the Pb/Al container may be omitted”. The final dose rate within the high dose rate lead-aluminum enclosure was determined based on TLD dosimetry measurements (see previous section). The final dose rate for this work was 50.5rad(Si)/s with a precision of ±5%. An ISO 9001:2008 and DSCC Certified Company 4 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 4.0. Tested Parameters During the radiation lot acceptance testing the following pre- and post-irradiation electrical parameters were measured: 1. Positive Supply Current 2. Negative Supply Current 3. Input Offset Voltage (Op Amp 1-4) 4. Input Offset Current (Op Amp 1-4) 5. + Input Bias Current (Op Amp 1-4) 6. - Input Bias Current (Op Amp 1-4) 7. CMRR (Op Amp 1-4) 8. PSRR (Op Amp 1-4) 9. Large Signal Voltage Gain RL=500 (Op Amp 1-4) 10. Large Signal Voltage Gain RL=100 (Op Amp 1-4) 11. Channel Separation (Op Amp 1-4, all permutations) 12. Output Voltage Swing High RL=500 (Op Amp 1-4) 13. Output Voltage Swing High RL=100 (Op Amp 1-4) 14. Output Voltage Swing Low RL=500 (Op Amp 1-4) 15. Output Voltage Swing Low RL=100 (Op Amp 1-4) 16. Maximum Output Source Current (Op Amp 1-4) 17. Maximum Output Sink Current (Op Amp 1-4) 18. Positive Short-Circuit Current (Op Amp 1-4) 19. Negative Short-Circuit Current (Op Amp 1-4) The parametric data was obtained as read and record and all the raw data plus an attributes summary are contained in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.065 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 10-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the RLAT: following the radiation exposure each of the 10 pieces irradiated under electrical bias shall pass the specification value. If any of the 10 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. An ISO 9001:2008 and DSCC Certified Company 5 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 5.0. Total Ionizing Dose Test Results Based on this criterion the RH1814MW QUAD OP AMP (from the lot date code identified on the first page of this test report) PASSED the RLAT to the maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications. The data shown in this report uses much finer dose increments at the low dose levels to better understand the low total dose performance. In previous tests (with larger dose increments) we have observed degradation of selected VOS, CMRR and PSRR parameters with the units improving with total dose, passing at the 100krad(Si) and 200krad(Si) dose levels. It appears that using relatively large dose increments can cause a low total dose “failure” possible due to a slightly different radiation response of matching of OpAmp input transistors. The LT1814 datasheet p.12 "Circuit Operation" discussion describes complementary NPN and PNP emitter followers buffering input transistors. Uneven gamma-induced degradation of the various input transistors could produce large voltage offsets, possibly recovering after significant charge saturation in the oxides. Figures 5.1 through 5.152 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.152 show the corresponding raw data for each of these parameters. In the data plots the solid diamonds are the average of the measured data points for the sample irradiated under electrical bias while the shaded diamonds are the average of the measured data points for the units irradiated with all pins tied to ground. The black lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or dashed) are the average of the data points after application of the KTL statistics on the sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or postirradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. The control units, as expected, show no significant changes to any of the parameters. Therefore we can conclude that the electrical testing remained in control throughout the duration of the tests and the observed degradation was due to the radiation exposure. An ISO 9001:2008 and DSCC Certified Company 6 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX 1.50E-02 Positive Supply Current @+/-5V (A) 1.45E-02 1.40E-02 1.35E-02 1.30E-02 1.25E-02 1.20E-02 1.15E-02 1.10E-02 1.05E-02 1.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.1. Plot of Positive Supply Current @+/-5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 7 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.1. Raw data for Positive Supply Current @+/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @+/-5V (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 1.21E-02 1.19E-02 1.21E-02 1.18E-02 1.21E-02 1.23E-02 1.18E-02 1.20E-02 1.18E-02 1.22E-02 1.20E-02 1.22E-02 10 1.20E-02 1.18E-02 1.19E-02 1.17E-02 1.19E-02 1.22E-02 1.16E-02 1.17E-02 1.16E-02 1.20E-02 1.19E-02 1.20E-02 20 1.19E-02 1.17E-02 1.18E-02 1.15E-02 1.18E-02 1.21E-02 1.15E-02 1.17E-02 1.15E-02 1.19E-02 1.18E-02 1.20E-02 30 1.18E-02 1.16E-02 1.18E-02 1.15E-02 1.18E-02 1.20E-02 1.15E-02 1.16E-02 1.15E-02 1.18E-02 1.19E-02 1.20E-02 40 1.18E-02 1.16E-02 1.17E-02 1.14E-02 1.17E-02 1.19E-02 1.14E-02 1.16E-02 1.14E-02 1.17E-02 1.19E-02 1.21E-02 50 1.17E-02 1.15E-02 1.17E-02 1.13E-02 1.16E-02 1.19E-02 1.13E-02 1.15E-02 1.13E-02 1.17E-02 1.19E-02 1.21E-02 60 1.16E-02 1.14E-02 1.16E-02 1.11E-02 1.16E-02 1.18E-02 1.12E-02 1.14E-02 1.13E-02 1.16E-02 1.19E-02 1.21E-02 70 1.16E-02 1.13E-02 1.15E-02 1.10E-02 1.15E-02 1.17E-02 1.12E-02 1.14E-02 1.12E-02 1.15E-02 1.19E-02 1.21E-02 75 1.16E-02 1.13E-02 1.15E-02 1.10E-02 1.15E-02 1.17E-02 1.12E-02 1.13E-02 1.12E-02 1.15E-02 1.19E-02 1.21E-02 100 1.14E-02 1.11E-02 1.13E-02 1.07E-02 1.13E-02 1.15E-02 1.10E-02 1.12E-02 1.10E-02 1.13E-02 1.19E-02 1.21E-02 200 1.04E-02 1.01E-02 1.03E-02 9.54E-03 1.03E-02 1.04E-02 9.98E-03 1.02E-02 1.00E-02 1.02E-02 1.19E-02 1.21E-02 1.20E-02 1.81E-04 1.24E-02 1.16E-02 1.44E-02 PASS 1.18E-02 1.91E-04 1.22E-02 1.14E-02 1.44E-02 PASS 1.17E-02 1.94E-04 1.21E-02 1.13E-02 1.44E-02 PASS 1.17E-02 1.90E-04 1.21E-02 1.13E-02 1.44E-02 PASS 1.16E-02 1.93E-04 1.20E-02 1.12E-02 1.44E-02 PASS 1.15E-02 1.97E-04 1.19E-02 1.11E-02 1.44E-02 PASS 1.15E-02 2.06E-04 1.19E-02 1.10E-02 1.44E-02 PASS 1.14E-02 2.09E-04 1.18E-02 1.10E-02 1.44E-02 PASS 1.14E-02 2.13E-04 1.18E-02 1.09E-02 1.44E-02 PASS 1.12E-02 2.38E-04 1.17E-02 1.07E-02 1.44E-02 PASS 1.01E-02 2.59E-04 1.07E-02 9.61E-03 1.44E-02 PASS An ISO 9001:2008 and DSCC Certified Company 8 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN -1.00E-02 Negative Supply Current @+/-5V (A) -1.05E-02 -1.10E-02 -1.15E-02 -1.20E-02 -1.25E-02 -1.30E-02 -1.35E-02 -1.40E-02 -1.45E-02 -1.50E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.2. Plot of Negative Supply Current @+/-5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 9 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.2. Raw data for Negative Supply Current @+/-5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @+/-5V (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 -1.21E-02 -1.19E-02 -1.21E-02 -1.19E-02 -1.21E-02 -1.24E-02 -1.18E-02 -1.21E-02 -1.18E-02 -1.22E-02 -1.20E-02 -1.22E-02 10 -1.20E-02 -1.18E-02 -1.20E-02 -1.17E-02 -1.19E-02 -1.22E-02 -1.16E-02 -1.18E-02 -1.16E-02 -1.20E-02 -1.19E-02 -1.21E-02 20 -1.19E-02 -1.17E-02 -1.19E-02 -1.16E-02 -1.19E-02 -1.21E-02 -1.15E-02 -1.17E-02 -1.16E-02 -1.19E-02 -1.19E-02 -1.21E-02 30 -1.19E-02 -1.16E-02 -1.18E-02 -1.15E-02 -1.18E-02 -1.21E-02 -1.15E-02 -1.17E-02 -1.15E-02 -1.18E-02 -1.19E-02 -1.21E-02 40 -1.18E-02 -1.16E-02 -1.18E-02 -1.14E-02 -1.17E-02 -1.20E-02 -1.14E-02 -1.16E-02 -1.14E-02 -1.18E-02 -1.19E-02 -1.21E-02 50 -1.17E-02 -1.15E-02 -1.17E-02 -1.13E-02 -1.17E-02 -1.19E-02 -1.14E-02 -1.15E-02 -1.14E-02 -1.17E-02 -1.19E-02 -1.21E-02 60 -1.17E-02 -1.14E-02 -1.16E-02 -1.12E-02 -1.16E-02 -1.18E-02 -1.13E-02 -1.15E-02 -1.13E-02 -1.16E-02 -1.19E-02 -1.21E-02 70 -1.16E-02 -1.14E-02 -1.16E-02 -1.11E-02 -1.15E-02 -1.18E-02 -1.12E-02 -1.14E-02 -1.12E-02 -1.16E-02 -1.19E-02 -1.21E-02 75 -1.16E-02 -1.13E-02 -1.16E-02 -1.10E-02 -1.15E-02 -1.17E-02 -1.12E-02 -1.14E-02 -1.13E-02 -1.16E-02 -1.19E-02 -1.21E-02 100 -1.14E-02 -1.12E-02 -1.14E-02 -1.07E-02 -1.13E-02 -1.15E-02 -1.10E-02 -1.12E-02 -1.10E-02 -1.13E-02 -1.19E-02 -1.21E-02 200 -1.04E-02 -1.02E-02 -1.04E-02 -9.59E-03 -1.03E-02 -1.05E-02 -1.00E-02 -1.02E-02 -1.00E-02 -1.03E-02 -1.19E-02 -1.21E-02 -1.20E-02 1.83E-04 -1.17E-02 -1.24E-02 -1.44E-02 PASS -1.19E-02 1.92E-04 -1.15E-02 -1.23E-02 -1.44E-02 PASS -1.18E-02 1.92E-04 -1.14E-02 -1.22E-02 -1.44E-02 PASS -1.17E-02 1.90E-04 -1.13E-02 -1.21E-02 -1.44E-02 PASS -1.17E-02 1.96E-04 -1.13E-02 -1.21E-02 -1.44E-02 PASS -1.16E-02 2.01E-04 -1.12E-02 -1.20E-02 -1.44E-02 PASS -1.15E-02 2.09E-04 -1.11E-02 -1.19E-02 -1.44E-02 PASS -1.14E-02 2.10E-04 -1.10E-02 -1.19E-02 -1.44E-02 PASS -1.14E-02 2.14E-04 -1.10E-02 -1.19E-02 -1.44E-02 PASS -1.12E-02 2.36E-04 -1.07E-02 -1.17E-02 -1.44E-02 PASS -1.02E-02 2.56E-04 -9.65E-03 -1.07E-02 -1.44E-02 PASS An ISO 9001:2008 and DSCC Certified Company 10 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @+/-5V #1 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.3. Plot of Input Offset Voltage @+/-5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 11 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.3. Raw data for Input Offset Voltage @+/-5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @+/-5V #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -9.80E-05 -1.40E-05 -3.90E-05 -8.52E-04 -1.31E-04 -6.33E-04 -2.91E-04 -2.49E-04 -3.04E-04 -1.26E-04 -3.50E-04 -4.23E-04 10 -1.68E-04 -6.60E-05 -1.09E-04 -9.12E-04 -2.01E-04 -6.83E-04 -3.60E-04 -3.32E-04 -3.86E-04 -2.02E-04 -3.53E-04 -4.25E-04 20 -2.41E-04 -1.40E-04 -1.77E-04 -1.04E-03 -2.56E-04 -7.61E-04 -4.30E-04 -4.10E-04 -4.60E-04 -2.76E-04 -3.55E-04 -4.24E-04 30 -2.84E-04 -1.85E-04 -2.48E-04 -1.13E-03 -3.18E-04 -8.09E-04 -4.88E-04 -4.68E-04 -5.25E-04 -3.30E-04 -3.55E-04 -4.26E-04 40 -3.43E-04 -2.34E-04 -3.00E-04 -1.25E-03 -3.63E-04 -8.62E-04 -5.21E-04 -5.30E-04 -5.82E-04 -3.63E-04 -3.55E-04 -4.25E-04 50 -3.87E-04 -2.70E-04 -3.54E-04 -1.36E-03 -4.13E-04 -8.93E-04 -5.55E-04 -5.67E-04 -6.13E-04 -3.80E-04 -3.55E-04 -4.28E-04 60 -4.23E-04 -2.94E-04 -3.95E-04 -1.48E-03 -4.50E-04 -9.18E-04 -5.93E-04 -6.18E-04 -6.53E-04 -4.13E-04 -3.55E-04 -4.27E-04 70 -4.60E-04 -3.07E-04 -4.40E-04 -1.57E-03 -4.99E-04 -9.37E-04 -6.08E-04 -6.36E-04 -6.77E-04 -4.22E-04 -3.55E-04 -4.27E-04 75 -4.48E-04 -2.90E-04 -4.32E-04 -1.58E-03 -4.87E-04 -9.05E-04 -6.02E-04 -6.27E-04 -6.75E-04 -4.02E-04 -3.56E-04 -4.25E-04 100 -5.72E-04 -4.04E-04 -5.58E-04 -1.86E-03 -6.21E-04 -1.02E-03 -6.95E-04 -7.43E-04 -7.96E-04 -4.88E-04 -3.55E-04 -4.26E-04 200 -1.16E-03 -8.04E-04 -1.21E-03 -2.28E-03 -1.25E-03 -1.50E-03 -1.24E-03 -1.34E-03 -1.33E-03 -9.44E-04 -3.55E-04 -4.27E-04 -2.74E-04 2.71E-04 2.86E-04 -8.33E-04 -1.50E-03 PASS 1.50E-03 PASS -3.42E-04 2.67E-04 2.10E-04 -8.94E-04 -2.00E-03 PASS 2.00E-03 PASS -4.19E-04 2.82E-04 1.63E-04 -1.00E-03 -2.00E-03 PASS 2.00E-03 PASS -4.79E-04 2.91E-04 1.23E-04 -1.08E-03 -2.00E-03 PASS 2.00E-03 PASS -5.35E-04 3.10E-04 1.06E-04 -1.18E-03 -2.00E-03 PASS 2.00E-03 PASS -5.79E-04 3.27E-04 9.63E-05 -1.26E-03 -4.00E-03 PASS 4.00E-03 PASS -6.23E-04 3.48E-04 9.60E-05 -1.34E-03 -4.00E-03 PASS 4.00E-03 PASS -6.55E-04 3.64E-04 9.73E-05 -1.41E-03 -4.00E-03 PASS 4.00E-03 PASS -6.45E-04 3.72E-04 1.23E-04 -1.41E-03 -4.00E-03 PASS 4.00E-03 PASS -7.75E-04 4.17E-04 8.71E-05 -1.64E-03 -4.00E-03 PASS 4.00E-03 PASS -1.31E-03 3.96E-04 -4.88E-04 -2.12E-03 -4.00E-03 PASS 4.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 12 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @+/-5V #2 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.4. Plot of Input Offset Voltage @+/-5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 13 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.4. Raw data for Input Offset Voltage @+/-5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @+/-5V #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -1.00E-04 -5.41E-04 -2.09E-04 -2.46E-04 7.40E-05 3.34E-04 -5.32E-04 -7.00E-05 -1.89E-04 -2.53E-04 -1.93E-04 -5.97E-04 10 -1.42E-04 -5.94E-04 -2.78E-04 -2.96E-04 2.80E-05 2.61E-04 -5.90E-04 -1.20E-04 -2.53E-04 -3.73E-04 -1.91E-04 -5.97E-04 20 -1.84E-04 -6.50E-04 -3.54E-04 -3.79E-04 -2.20E-05 1.92E-04 -6.52E-04 -1.85E-04 -3.18E-04 -4.67E-04 -1.91E-04 -5.98E-04 30 -2.25E-04 -6.89E-04 -4.13E-04 -4.51E-04 -5.10E-05 1.29E-04 -6.99E-04 -2.31E-04 -3.76E-04 -5.34E-04 -1.93E-04 -5.97E-04 40 -2.78E-04 -7.20E-04 -4.76E-04 -5.41E-04 -7.50E-05 8.60E-05 -7.36E-04 -2.78E-04 -4.23E-04 -6.06E-04 -1.92E-04 -5.96E-04 50 -3.06E-04 -7.38E-04 -5.29E-04 -6.33E-04 -1.07E-04 4.70E-05 -7.67E-04 -3.03E-04 -4.55E-04 -6.57E-04 -1.92E-04 -6.00E-04 60 -3.30E-04 -7.58E-04 -5.76E-04 -7.33E-04 -1.28E-04 1.40E-05 -8.12E-04 -3.29E-04 -4.87E-04 -7.10E-04 -1.93E-04 -5.98E-04 70 -3.46E-04 -7.76E-04 -5.99E-04 -8.27E-04 -1.43E-04 -1.70E-05 -8.25E-04 -3.53E-04 -5.17E-04 -7.60E-04 -1.93E-04 -5.97E-04 75 -3.43E-04 -7.50E-04 -5.94E-04 -8.32E-04 -1.30E-04 -7.00E-06 -8.16E-04 -3.44E-04 -5.09E-04 -7.64E-04 -1.93E-04 -6.01E-04 100 -4.32E-04 -8.28E-04 -7.11E-04 -1.10E-03 -2.25E-04 -1.08E-04 -8.98E-04 -4.36E-04 -6.19E-04 -8.99E-04 -1.93E-04 -6.00E-04 200 -9.29E-04 -1.21E-03 -1.32E-03 -1.68E-03 -6.49E-04 -5.65E-04 -1.36E-03 -8.97E-04 -1.17E-03 -1.68E-03 -1.93E-04 -5.98E-04 -1.73E-04 2.61E-04 3.65E-04 -7.12E-04 -1.50E-03 PASS 1.50E-03 PASS -2.36E-04 2.62E-04 3.05E-04 -7.76E-04 -2.00E-03 PASS 2.00E-03 PASS -3.02E-04 2.65E-04 2.44E-04 -8.48E-04 -2.00E-03 PASS 2.00E-03 PASS -3.54E-04 2.65E-04 1.94E-04 -9.02E-04 -2.00E-03 PASS 2.00E-03 PASS -4.05E-04 2.70E-04 1.53E-04 -9.62E-04 -2.00E-03 PASS 2.00E-03 PASS -4.45E-04 2.73E-04 1.20E-04 -1.01E-03 -4.00E-03 PASS 4.00E-03 PASS -4.85E-04 2.84E-04 1.02E-04 -1.07E-03 -4.00E-03 PASS 4.00E-03 PASS -5.16E-04 2.92E-04 8.76E-05 -1.12E-03 -4.00E-03 PASS 4.00E-03 PASS -5.09E-04 2.94E-04 9.88E-05 -1.12E-03 -4.00E-03 PASS 4.00E-03 PASS -6.26E-04 3.21E-04 3.68E-05 -1.29E-03 -4.00E-03 PASS 4.00E-03 PASS -1.15E-03 3.86E-04 -3.48E-04 -1.94E-03 -4.00E-03 PASS 4.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 14 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @+/-5V #3 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.5. Plot of Input Offset Voltage @+/-5V #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 15 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.5. Raw data for Input Offset Voltage @+/-5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @+/-5V #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -3.47E-04 -7.51E-04 -5.68E-04 -1.88E-04 -1.36E-04 -6.36E-04 9.90E-05 -2.25E-04 -2.01E-04 -1.93E-04 5.00E-05 -2.41E-04 10 -3.92E-04 -7.93E-04 -6.28E-04 -2.37E-04 -1.86E-04 -7.11E-04 4.00E-05 -2.50E-04 -2.73E-04 -2.75E-04 5.40E-05 -2.49E-04 20 -4.62E-04 -8.57E-04 -7.03E-04 -3.28E-04 -2.54E-04 -7.87E-04 -2.30E-05 -2.62E-04 -3.53E-04 -3.64E-04 5.30E-05 -2.49E-04 30 -5.04E-04 -8.97E-04 -7.53E-04 -4.15E-04 -2.94E-04 -8.52E-04 -7.30E-05 -2.76E-04 -4.32E-04 -4.32E-04 5.00E-05 -2.50E-04 40 -5.60E-04 -9.32E-04 -7.96E-04 -5.13E-04 -3.36E-04 -9.09E-04 -1.21E-04 -2.95E-04 -4.96E-04 -4.96E-04 5.00E-05 -2.49E-04 50 -5.86E-04 -9.54E-04 -8.49E-04 -5.90E-04 -3.48E-04 -9.58E-04 -1.56E-04 -2.92E-04 -5.35E-04 -5.57E-04 5.00E-05 -2.49E-04 60 -6.19E-04 -9.80E-04 -8.73E-04 -6.78E-04 -3.71E-04 -9.96E-04 -2.00E-04 -3.22E-04 -5.78E-04 -5.92E-04 4.90E-05 -2.49E-04 70 -6.40E-04 -9.92E-04 -9.09E-04 -7.63E-04 -3.72E-04 -1.03E-03 -2.23E-04 -3.21E-04 -6.26E-04 -6.36E-04 5.00E-05 -2.49E-04 75 -6.36E-04 -9.73E-04 -8.91E-04 -7.69E-04 -3.60E-04 -1.01E-03 -2.31E-04 -3.18E-04 -6.25E-04 -6.34E-04 5.00E-05 -2.49E-04 100 -7.30E-04 -1.05E-03 -9.94E-04 -1.03E-03 -4.40E-04 -1.13E-03 -3.43E-04 -3.77E-04 -7.80E-04 -7.79E-04 5.00E-05 -2.49E-04 200 -1.27E-03 -1.39E-03 -1.51E-03 -1.45E-03 -8.41E-04 -1.70E-03 -9.29E-04 -7.04E-04 -1.49E-03 -1.50E-03 4.70E-05 -2.49E-04 -3.15E-04 2.61E-04 2.25E-04 -8.54E-04 -1.50E-03 PASS 1.50E-03 PASS -3.71E-04 2.61E-04 1.69E-04 -9.10E-04 -2.00E-03 PASS 2.00E-03 PASS -4.39E-04 2.65E-04 1.07E-04 -9.86E-04 -2.00E-03 PASS 2.00E-03 PASS -4.93E-04 2.66E-04 5.63E-05 -1.04E-03 -2.00E-03 PASS 2.00E-03 PASS -5.45E-04 2.66E-04 4.09E-06 -1.09E-03 -2.00E-03 PASS 2.00E-03 PASS -5.83E-04 2.74E-04 -1.73E-05 -1.15E-03 -4.00E-03 PASS 4.00E-03 PASS -6.21E-04 2.72E-04 -5.83E-05 -1.18E-03 -4.00E-03 PASS 4.00E-03 PASS -6.51E-04 2.80E-04 -7.21E-05 -1.23E-03 -4.00E-03 PASS 4.00E-03 PASS -6.45E-04 2.75E-04 -7.78E-05 -1.21E-03 -4.00E-03 PASS 4.00E-03 PASS -7.65E-04 2.93E-04 -1.61E-04 -1.37E-03 -4.00E-03 PASS 4.00E-03 PASS -1.28E-03 3.35E-04 -5.87E-04 -1.97E-03 -4.00E-03 PASS 4.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 16 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @+/-5V #4 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.6. Plot of Input Offset Voltage @+/-5V #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 17 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.6. Raw data for Input Offset Voltage @+/-5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @+/-5V #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -8.73E-04 -1.27E-04 -1.25E-04 -3.26E-04 -7.46E-04 -4.70E-05 -2.02E-04 -8.00E-04 -5.50E-05 4.20E-05 3.45E-04 -2.18E-04 10 -9.25E-04 -1.86E-04 -2.03E-04 -4.03E-04 -8.03E-04 -8.40E-05 -2.69E-04 -8.56E-04 -1.28E-04 -3.10E-05 3.40E-04 -2.18E-04 20 -9.94E-04 -2.65E-04 -2.89E-04 -5.04E-04 -8.69E-04 -1.30E-04 -3.43E-04 -9.12E-04 -2.05E-04 -1.17E-04 3.38E-04 -2.19E-04 30 -1.04E-03 -3.14E-04 -3.65E-04 -6.02E-04 -9.22E-04 -1.59E-04 -3.95E-04 -9.65E-04 -2.74E-04 -1.76E-04 3.38E-04 -2.21E-04 40 -1.10E-03 -3.59E-04 -4.42E-04 -7.11E-04 -9.72E-04 -2.04E-04 -4.42E-04 -9.98E-04 -3.21E-04 -2.15E-04 3.38E-04 -2.20E-04 50 -1.13E-03 -3.91E-04 -5.13E-04 -8.14E-04 -1.02E-03 -2.34E-04 -4.73E-04 -1.02E-03 -3.64E-04 -2.49E-04 3.39E-04 -2.21E-04 60 -1.16E-03 -4.16E-04 -5.59E-04 -9.12E-04 -1.06E-03 -2.62E-04 -5.27E-04 -1.05E-03 -3.89E-04 -2.64E-04 3.38E-04 -2.21E-04 70 -1.18E-03 -4.35E-04 -6.19E-04 -1.01E-03 -1.10E-03 -2.86E-04 -5.43E-04 -1.07E-03 -4.09E-04 -2.86E-04 3.39E-04 -2.21E-04 75 -1.17E-03 -4.13E-04 -6.16E-04 -1.03E-03 -1.10E-03 -2.74E-04 -5.22E-04 -1.05E-03 -3.99E-04 -2.68E-04 3.38E-04 -2.21E-04 100 -1.26E-03 -5.16E-04 -7.53E-04 -1.30E-03 -1.23E-03 -3.54E-04 -6.14E-04 -1.13E-03 -5.10E-04 -3.68E-04 3.38E-04 -2.21E-04 200 -1.70E-03 -1.02E-03 -1.48E-03 -1.77E-03 -1.90E-03 -7.88E-04 -1.14E-03 -1.59E-03 -1.01E-03 -8.66E-04 3.39E-04 -2.21E-04 -3.26E-04 3.47E-04 3.90E-04 -1.04E-03 -1.50E-03 PASS 1.50E-03 PASS -3.89E-04 3.43E-04 3.19E-04 -1.10E-03 -2.00E-03 PASS 2.00E-03 PASS -4.63E-04 3.38E-04 2.36E-04 -1.16E-03 -2.00E-03 PASS 2.00E-03 PASS -5.21E-04 3.38E-04 1.77E-04 -1.22E-03 -2.00E-03 PASS 2.00E-03 PASS -5.77E-04 3.41E-04 1.28E-04 -1.28E-03 -2.00E-03 PASS 2.00E-03 PASS -6.21E-04 3.43E-04 8.70E-05 -1.33E-03 -4.00E-03 PASS 4.00E-03 PASS -6.59E-04 3.49E-04 6.15E-05 -1.38E-03 -4.00E-03 PASS 4.00E-03 PASS -6.93E-04 3.57E-04 4.41E-05 -1.43E-03 -4.00E-03 PASS 4.00E-03 PASS -6.84E-04 3.63E-04 6.54E-05 -1.43E-03 -4.00E-03 PASS 4.00E-03 PASS -8.04E-04 3.87E-04 -4.89E-06 -1.60E-03 -4.00E-03 PASS 4.00E-03 PASS -1.33E-03 4.05E-04 -4.89E-04 -2.16E-03 -4.00E-03 PASS 4.00E-03 PASS An ISO 9001:2008 and DSCC Certified Company 18 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @+/-5V #1 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.7. Plot of Input Offset Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 19 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.7. Raw data for Input Offset Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -3.00E-08 2.00E-08 2.00E-08 0.00E+00 -1.00E-08 0.00E+00 0.00E+00 0.00E+00 2.00E-08 2.00E-08 0.00E+00 0.00E+00 10 -2.00E-08 4.00E-08 5.00E-08 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 5.00E-08 4.00E-08 0.00E+00 0.00E+00 20 -3.00E-08 6.00E-08 6.00E-08 1.00E-08 0.00E+00 0.00E+00 0.00E+00 0.00E+00 7.00E-08 6.00E-08 0.00E+00 0.00E+00 30 -3.00E-08 7.00E-08 8.00E-08 2.00E-08 0.00E+00 0.00E+00 0.00E+00 1.00E-08 9.00E-08 8.00E-08 0.00E+00 0.00E+00 40 -4.00E-08 9.00E-08 1.00E-07 3.00E-08 0.00E+00 -1.00E-08 0.00E+00 1.00E-08 1.10E-07 1.00E-07 0.00E+00 0.00E+00 50 -5.00E-08 1.10E-07 1.10E-07 4.00E-08 0.00E+00 -2.00E-08 -1.00E-08 0.00E+00 1.30E-07 1.10E-07 0.00E+00 0.00E+00 60 -6.00E-08 1.20E-07 1.20E-07 4.00E-08 0.00E+00 -2.00E-08 -1.00E-08 1.00E-08 1.40E-07 1.30E-07 0.00E+00 0.00E+00 70 -7.00E-08 1.30E-07 1.40E-07 5.00E-08 0.00E+00 -2.00E-08 -2.00E-08 1.00E-08 1.60E-07 1.40E-07 0.00E+00 0.00E+00 75 -8.00E-08 1.40E-07 1.50E-07 6.00E-08 0.00E+00 -2.00E-08 -2.00E-08 2.00E-08 1.70E-07 1.50E-07 0.00E+00 0.00E+00 100 -9.00E-08 1.70E-07 1.80E-07 1.10E-07 0.00E+00 -2.00E-08 -2.00E-08 3.00E-08 2.20E-07 1.80E-07 0.00E+00 0.00E+00 200 -2.00E-07 2.80E-07 3.20E-07 1.20E-07 -3.00E-08 -9.00E-08 -9.00E-08 3.00E-08 4.10E-07 3.30E-07 0.00E+00 0.00E+00 4.00E-09 1.65E-08 3.80E-08 -3.00E-08 -4.00E-07 PASS 4.00E-07 PASS 1.60E-08 2.59E-08 6.95E-08 -3.75E-08 -5.00E-07 PASS 5.00E-07 PASS 2.30E-08 3.56E-08 9.65E-08 -5.05E-08 -5.00E-07 PASS 5.00E-07 PASS 3.20E-08 4.34E-08 1.22E-07 -5.76E-08 -5.00E-07 PASS 5.00E-07 PASS 3.90E-08 5.55E-08 1.54E-07 -7.55E-08 -5.00E-07 PASS 5.00E-07 PASS 4.20E-08 6.68E-08 1.80E-07 -9.59E-08 -7.50E-07 PASS 7.50E-07 PASS 4.70E-08 7.38E-08 1.99E-07 -1.05E-07 -7.50E-07 PASS 7.50E-07 PASS 5.20E-08 8.36E-08 2.25E-07 -1.21E-07 -7.50E-07 PASS 7.50E-07 PASS 5.70E-08 8.96E-08 2.42E-07 -1.28E-07 -7.50E-07 PASS 7.50E-07 PASS 7.60E-08 1.09E-07 3.00E-07 -1.48E-07 -1.00E-06 PASS 1.00E-06 PASS 1.08E-07 2.14E-07 5.51E-07 -3.35E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 20 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @+/-5V #2 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.8. Plot of Input Offset Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 21 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.8. Raw data for Input Offset Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 1.00E-08 -2.00E-08 1.00E-08 0.00E+00 -1.00E-08 2.00E-08 0.00E+00 -2.00E-08 0.00E+00 0.00E+00 3.00E-08 2.00E-08 10 1.00E-08 0.00E+00 4.00E-08 0.00E+00 0.00E+00 4.00E-08 2.00E-08 0.00E+00 2.00E-08 0.00E+00 3.00E-08 2.00E-08 20 0.00E+00 2.00E-08 5.00E-08 3.00E-08 3.00E-08 6.00E-08 4.00E-08 2.00E-08 4.00E-08 0.00E+00 3.00E-08 2.00E-08 30 0.00E+00 4.00E-08 5.00E-08 5.00E-08 4.00E-08 7.00E-08 6.00E-08 4.00E-08 5.00E-08 0.00E+00 3.00E-08 2.00E-08 40 0.00E+00 5.00E-08 6.00E-08 8.00E-08 6.00E-08 9.00E-08 7.00E-08 5.00E-08 7.00E-08 -2.00E-08 3.00E-08 2.00E-08 50 0.00E+00 7.00E-08 7.00E-08 1.00E-07 7.00E-08 1.00E-07 8.00E-08 6.00E-08 8.00E-08 -3.00E-08 3.00E-08 2.00E-08 60 0.00E+00 8.00E-08 7.00E-08 1.30E-07 9.00E-08 1.20E-07 9.00E-08 8.00E-08 1.00E-07 -4.00E-08 3.00E-08 2.00E-08 70 -1.00E-08 1.00E-07 8.00E-08 1.60E-07 1.10E-07 1.40E-07 1.10E-07 9.00E-08 1.10E-07 -4.00E-08 3.00E-08 2.00E-08 75 -1.00E-08 1.10E-07 8.00E-08 1.70E-07 1.10E-07 1.50E-07 1.10E-07 1.10E-07 1.20E-07 -4.00E-08 3.00E-08 2.00E-08 100 -2.00E-08 1.40E-07 1.00E-07 2.60E-07 1.50E-07 1.80E-07 1.30E-07 1.40E-07 1.50E-07 -5.00E-08 3.00E-08 1.00E-08 200 -1.10E-07 2.80E-07 2.10E-07 3.90E-07 2.80E-07 3.10E-07 2.60E-07 2.80E-07 2.90E-07 -1.50E-07 3.00E-08 2.00E-08 -1.00E-09 1.29E-08 2.56E-08 -2.76E-08 -4.00E-07 PASS 4.00E-07 PASS 1.30E-08 1.64E-08 4.68E-08 -2.08E-08 -5.00E-07 PASS 5.00E-07 PASS 2.90E-08 1.97E-08 6.97E-08 -1.17E-08 -5.00E-07 PASS 5.00E-07 PASS 4.00E-08 2.31E-08 8.77E-08 -7.69E-09 -5.00E-07 PASS 5.00E-07 PASS 5.10E-08 3.48E-08 1.23E-07 -2.08E-08 -5.00E-07 PASS 5.00E-07 PASS 6.00E-08 4.22E-08 1.47E-07 -2.71E-08 -7.50E-07 PASS 7.50E-07 PASS 7.20E-08 5.27E-08 1.81E-07 -3.67E-08 -7.50E-07 PASS 7.50E-07 PASS 8.50E-08 6.28E-08 2.15E-07 -4.46E-08 -7.50E-07 PASS 7.50E-07 PASS 9.10E-08 6.62E-08 2.28E-07 -4.58E-08 -7.50E-07 PASS 7.50E-07 PASS 1.18E-07 9.11E-08 3.06E-07 -7.02E-08 -1.00E-06 PASS 1.00E-06 PASS 2.04E-07 1.82E-07 5.80E-07 -1.72E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 22 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @+/-5V #3 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.9. Plot of Input Offset Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 23 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.9. Raw data for Input Offset Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -2.00E-08 -2.00E-08 2.00E-08 0.00E+00 0.00E+00 -2.00E-08 0.00E+00 0.00E+00 0.00E+00 -1.00E-08 1.00E-08 0.00E+00 10 -1.00E-08 0.00E+00 4.00E-08 2.00E-08 2.00E-08 -1.00E-08 3.00E-08 -1.00E-08 0.00E+00 -1.00E-08 1.00E-08 0.00E+00 20 -1.00E-08 2.00E-08 6.00E-08 4.00E-08 4.00E-08 -2.00E-08 4.00E-08 -1.00E-08 0.00E+00 0.00E+00 1.00E-08 0.00E+00 30 -2.00E-08 3.00E-08 8.00E-08 7.00E-08 6.00E-08 -2.00E-08 6.00E-08 -2.00E-08 -2.00E-08 -2.00E-08 1.00E-08 0.00E+00 40 -2.00E-08 5.00E-08 1.00E-07 9.00E-08 7.00E-08 -3.00E-08 7.00E-08 -2.00E-08 -2.00E-08 -2.00E-08 1.00E-08 0.00E+00 50 -2.00E-08 6.00E-08 1.10E-07 1.10E-07 9.00E-08 -5.00E-08 9.00E-08 -2.00E-08 -3.00E-08 -3.00E-08 1.00E-08 0.00E+00 60 -2.00E-08 7.00E-08 1.20E-07 1.40E-07 1.10E-07 -5.00E-08 1.00E-07 -2.00E-08 -4.00E-08 -4.00E-08 1.00E-08 0.00E+00 70 -3.00E-08 9.00E-08 1.40E-07 1.70E-07 1.20E-07 -7.00E-08 1.20E-07 -3.00E-08 -4.00E-08 -4.00E-08 1.00E-08 0.00E+00 75 -3.00E-08 1.00E-07 1.50E-07 1.80E-07 1.30E-07 -6.00E-08 1.30E-07 -4.00E-08 -4.00E-08 -4.00E-08 1.00E-08 0.00E+00 100 -3.00E-08 1.30E-07 1.80E-07 2.60E-07 1.60E-07 -7.00E-08 1.50E-07 -4.00E-08 -5.00E-08 -5.00E-08 1.00E-08 0.00E+00 200 -9.00E-08 2.60E-07 3.20E-07 4.20E-07 2.90E-07 -1.80E-07 2.90E-07 -1.30E-07 -1.70E-07 -1.30E-07 1.00E-08 0.00E+00 -5.00E-09 1.27E-08 2.12E-08 -3.12E-08 -4.00E-07 PASS 4.00E-07 PASS 7.00E-09 1.89E-08 4.60E-08 -3.20E-08 -5.00E-07 PASS 5.00E-07 PASS 1.60E-08 2.76E-08 7.29E-08 -4.09E-08 -5.00E-07 PASS 5.00E-07 PASS 2.00E-08 4.40E-08 1.11E-07 -7.08E-08 -5.00E-07 PASS 5.00E-07 PASS 2.70E-08 5.33E-08 1.37E-07 -8.32E-08 -5.00E-07 PASS 5.00E-07 PASS 3.10E-08 6.62E-08 1.68E-07 -1.06E-07 -7.50E-07 PASS 7.50E-07 PASS 3.70E-08 7.73E-08 1.97E-07 -1.23E-07 -7.50E-07 PASS 7.50E-07 PASS 4.30E-08 9.24E-08 2.34E-07 -1.48E-07 -7.50E-07 PASS 7.50E-07 PASS 4.80E-08 9.72E-08 2.49E-07 -1.53E-07 -7.50E-07 PASS 7.50E-07 PASS 6.40E-08 1.23E-07 3.18E-07 -1.90E-07 -1.00E-06 PASS 1.00E-06 PASS 8.80E-08 2.45E-07 5.94E-07 -4.18E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 24 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @+/-5V #4 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.10. Plot of Input Offset Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 25 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.10. Raw data for Input Offset Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 0.00E+00 0.00E+00 -1.00E-08 0.00E+00 0.00E+00 -2.00E-08 3.00E-08 2.00E-08 0.00E+00 -1.00E-08 0.00E+00 1.00E-08 10 0.00E+00 0.00E+00 0.00E+00 -1.00E-08 2.00E-08 -1.00E-08 5.00E-08 6.00E-08 2.00E-08 0.00E+00 0.00E+00 1.00E-08 20 0.00E+00 0.00E+00 0.00E+00 -2.00E-08 3.00E-08 -2.00E-08 6.00E-08 9.00E-08 4.00E-08 3.00E-08 0.00E+00 1.00E-08 30 0.00E+00 0.00E+00 0.00E+00 -2.00E-08 4.00E-08 -2.00E-08 7.00E-08 1.20E-07 6.00E-08 5.00E-08 0.00E+00 1.00E-08 40 -1.00E-08 0.00E+00 -1.00E-08 -2.00E-08 5.00E-08 -3.00E-08 7.00E-08 1.40E-07 8.00E-08 6.00E-08 0.00E+00 1.00E-08 50 -2.00E-08 0.00E+00 -2.00E-08 -3.00E-08 5.00E-08 -3.00E-08 8.00E-08 1.70E-07 9.00E-08 8.00E-08 0.00E+00 1.00E-08 60 -2.00E-08 0.00E+00 -2.00E-08 -3.00E-08 5.00E-08 -3.00E-08 9.00E-08 1.90E-07 1.00E-07 9.00E-08 0.00E+00 1.00E-08 70 -3.00E-08 -1.00E-08 -2.00E-08 -3.00E-08 6.00E-08 -3.00E-08 1.00E-07 2.20E-07 1.20E-07 1.10E-07 0.00E+00 1.00E-08 75 -3.00E-08 0.00E+00 -3.00E-08 -4.00E-08 6.00E-08 -3.00E-08 1.00E-07 2.20E-07 1.20E-07 1.10E-07 0.00E+00 1.00E-08 100 -2.00E-08 -1.00E-08 -2.00E-08 -2.00E-08 8.00E-08 -2.00E-08 1.20E-07 2.90E-07 1.50E-07 1.50E-07 0.00E+00 1.00E-08 200 -1.00E-07 -6.00E-08 -7.00E-08 -1.30E-07 1.10E-07 -8.00E-08 2.00E-07 6.00E-07 2.80E-07 2.60E-07 0.00E+00 1.00E-08 1.00E-09 1.45E-08 3.09E-08 -2.89E-08 -4.00E-07 PASS 4.00E-07 PASS 1.30E-08 2.45E-08 6.36E-08 -3.76E-08 -5.00E-07 PASS 5.00E-07 PASS 2.10E-08 3.57E-08 9.48E-08 -5.28E-08 -5.00E-07 PASS 5.00E-07 PASS 3.00E-08 4.57E-08 1.24E-07 -6.44E-08 -5.00E-07 PASS 5.00E-07 PASS 3.30E-08 5.54E-08 1.47E-07 -8.14E-08 -5.00E-07 PASS 5.00E-07 PASS 3.70E-08 6.77E-08 1.77E-07 -1.03E-07 -7.50E-07 PASS 7.50E-07 PASS 4.20E-08 7.44E-08 1.96E-07 -1.12E-07 -7.50E-07 PASS 7.50E-07 PASS 4.90E-08 8.67E-08 2.28E-07 -1.30E-07 -7.50E-07 PASS 7.50E-07 PASS 4.80E-08 8.80E-08 2.30E-07 -1.34E-07 -7.50E-07 PASS 7.50E-07 PASS 7.00E-08 1.07E-07 2.90E-07 -1.50E-07 -1.00E-06 PASS 1.00E-06 PASS 1.01E-07 2.35E-07 5.87E-07 -3.85E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 26 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @+/-5V #1 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.11. Plot of Positive Input Bias Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 27 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.11. Raw data for Positive Input Bias Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.50E-07 3.60E-07 3.00E-07 3.10E-07 2.80E-07 3.80E-07 4.00E-07 3.80E-07 3.70E-07 3.80E-07 3.20E-07 3.50E-07 10 3.30E-07 3.30E-07 2.70E-07 2.80E-07 2.60E-07 3.40E-07 3.70E-07 3.30E-07 3.40E-07 3.40E-07 3.20E-07 3.50E-07 20 3.00E-07 3.10E-07 2.40E-07 2.60E-07 2.40E-07 3.10E-07 3.40E-07 3.00E-07 3.20E-07 3.10E-07 3.20E-07 3.50E-07 30 2.80E-07 3.00E-07 2.30E-07 2.50E-07 2.30E-07 3.00E-07 3.30E-07 2.90E-07 3.10E-07 2.90E-07 3.20E-07 3.50E-07 40 2.60E-07 2.90E-07 2.20E-07 2.40E-07 2.20E-07 2.80E-07 3.20E-07 2.70E-07 3.10E-07 2.80E-07 3.20E-07 3.50E-07 50 2.40E-07 2.80E-07 2.10E-07 2.30E-07 2.20E-07 2.70E-07 3.00E-07 2.60E-07 3.00E-07 2.80E-07 3.20E-07 3.50E-07 60 2.30E-07 2.80E-07 2.00E-07 2.30E-07 2.20E-07 2.70E-07 3.00E-07 2.50E-07 3.00E-07 2.80E-07 3.20E-07 3.50E-07 70 2.20E-07 2.80E-07 2.00E-07 2.20E-07 2.20E-07 2.70E-07 2.90E-07 2.40E-07 3.10E-07 2.80E-07 3.20E-07 3.50E-07 75 2.10E-07 2.90E-07 2.00E-07 2.30E-07 2.30E-07 2.70E-07 3.00E-07 2.50E-07 3.10E-07 2.90E-07 3.20E-07 3.50E-07 100 1.90E-07 2.80E-07 1.90E-07 2.20E-07 2.30E-07 2.60E-07 2.90E-07 2.40E-07 3.10E-07 2.80E-07 3.20E-07 3.50E-07 200 -5.00E-08 1.20E-07 2.00E-08 6.00E-08 1.10E-07 8.00E-08 1.20E-07 0.00E+00 2.00E-07 1.10E-07 3.20E-07 3.50E-07 3.51E-07 4.04E-08 4.34E-07 2.68E-07 -4.00E-06 PASS 4.00E-06 PASS 3.19E-07 3.60E-08 3.93E-07 2.45E-07 -5.00E-06 PASS 5.00E-06 PASS 2.93E-07 3.43E-08 3.64E-07 2.22E-07 -5.00E-06 PASS 5.00E-06 PASS 2.81E-07 3.38E-08 3.51E-07 2.11E-07 -5.00E-06 PASS 5.00E-06 PASS 2.69E-07 3.45E-08 3.40E-07 1.98E-07 -5.00E-06 PASS 5.00E-06 PASS 2.59E-07 3.25E-08 3.26E-07 1.92E-07 -7.50E-06 PASS 7.50E-06 PASS 2.56E-07 3.50E-08 3.28E-07 1.84E-07 -7.50E-06 PASS 7.50E-06 PASS 2.53E-07 3.74E-08 3.30E-07 1.76E-07 -7.50E-06 PASS 7.50E-06 PASS 2.58E-07 3.94E-08 3.39E-07 1.77E-07 -7.50E-06 PASS 7.50E-06 PASS 2.49E-07 4.18E-08 3.35E-07 1.63E-07 -1.00E-05 PASS 1.00E-05 PASS 7.70E-08 7.20E-08 2.26E-07 -7.16E-08 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 28 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @+/-5V #2 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.12. Plot of Positive Input Bias Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 29 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.12. Raw data for Positive Input Bias Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.70E-07 3.30E-07 3.90E-07 2.50E-07 3.30E-07 3.90E-07 3.20E-07 3.30E-07 3.10E-07 2.80E-07 4.10E-07 4.00E-07 10 3.40E-07 3.00E-07 3.70E-07 2.20E-07 2.90E-07 3.40E-07 2.90E-07 2.90E-07 2.80E-07 2.40E-07 4.10E-07 4.00E-07 20 3.30E-07 2.70E-07 3.60E-07 2.00E-07 2.70E-07 3.10E-07 2.60E-07 2.60E-07 2.50E-07 2.10E-07 4.10E-07 4.00E-07 30 3.10E-07 2.60E-07 3.60E-07 1.80E-07 2.50E-07 2.80E-07 2.40E-07 2.50E-07 2.30E-07 2.00E-07 4.10E-07 3.90E-07 40 3.00E-07 2.40E-07 3.50E-07 1.70E-07 2.40E-07 2.60E-07 2.30E-07 2.30E-07 2.20E-07 1.90E-07 4.10E-07 4.00E-07 50 2.90E-07 2.30E-07 3.60E-07 1.60E-07 2.30E-07 2.40E-07 2.20E-07 2.20E-07 2.10E-07 1.70E-07 4.10E-07 4.00E-07 60 2.90E-07 2.30E-07 3.60E-07 1.50E-07 2.30E-07 2.30E-07 2.10E-07 2.10E-07 2.00E-07 1.70E-07 4.10E-07 4.00E-07 70 2.90E-07 2.20E-07 3.70E-07 1.50E-07 2.30E-07 2.20E-07 2.10E-07 2.00E-07 2.00E-07 1.60E-07 4.10E-07 4.00E-07 75 2.90E-07 2.30E-07 3.80E-07 1.50E-07 2.40E-07 2.20E-07 2.10E-07 2.00E-07 2.00E-07 1.60E-07 4.10E-07 4.00E-07 100 2.80E-07 2.20E-07 3.90E-07 1.50E-07 2.40E-07 2.00E-07 2.00E-07 1.90E-07 1.90E-07 1.50E-07 4.10E-07 4.00E-07 200 1.40E-07 3.00E-08 3.70E-07 -3.00E-08 7.00E-08 -8.00E-08 0.00E+00 -3.00E-08 -1.00E-08 -5.00E-08 4.10E-07 4.00E-07 3.30E-07 4.50E-08 4.23E-07 2.37E-07 -4.00E-06 PASS 4.00E-06 PASS 2.96E-07 4.55E-08 3.90E-07 2.02E-07 -5.00E-06 PASS 5.00E-06 PASS 2.72E-07 4.98E-08 3.75E-07 1.69E-07 -5.00E-06 PASS 5.00E-06 PASS 2.56E-07 5.19E-08 3.63E-07 1.49E-07 -5.00E-06 PASS 5.00E-06 PASS 2.43E-07 5.17E-08 3.50E-07 1.36E-07 -5.00E-06 PASS 5.00E-06 PASS 2.33E-07 5.74E-08 3.51E-07 1.15E-07 -7.50E-06 PASS 7.50E-06 PASS 2.28E-07 5.98E-08 3.51E-07 1.05E-07 -7.50E-06 PASS 7.50E-06 PASS 2.25E-07 6.38E-08 3.57E-07 9.32E-08 -7.50E-06 PASS 7.50E-06 PASS 2.28E-07 6.65E-08 3.65E-07 9.07E-08 -7.50E-06 PASS 7.50E-06 PASS 2.21E-07 7.09E-08 3.67E-07 7.45E-08 -1.00E-05 PASS 1.00E-05 PASS 4.10E-08 1.32E-07 3.13E-07 -2.31E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 30 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @+/-5V #3 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.13. Plot of Positive Input Bias Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 31 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.13. Raw data for Positive Input Bias Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.70E-07 3.00E-07 4.00E-07 2.50E-07 3.40E-07 3.80E-07 3.30E-07 3.40E-07 3.20E-07 2.60E-07 3.70E-07 3.80E-07 10 3.40E-07 2.70E-07 3.60E-07 2.20E-07 3.00E-07 3.40E-07 3.00E-07 3.10E-07 2.80E-07 2.20E-07 3.70E-07 3.80E-07 20 3.20E-07 2.50E-07 3.40E-07 2.00E-07 2.80E-07 3.10E-07 2.70E-07 2.90E-07 2.70E-07 2.00E-07 3.70E-07 3.80E-07 30 3.10E-07 2.30E-07 3.30E-07 1.90E-07 2.70E-07 2.90E-07 2.50E-07 2.80E-07 2.50E-07 1.80E-07 3.70E-07 3.80E-07 40 2.90E-07 2.20E-07 3.10E-07 1.90E-07 2.60E-07 2.70E-07 2.40E-07 2.70E-07 2.40E-07 1.70E-07 3.70E-07 3.80E-07 50 2.80E-07 2.10E-07 3.00E-07 1.80E-07 2.50E-07 2.50E-07 2.40E-07 2.70E-07 2.30E-07 1.60E-07 3.70E-07 3.80E-07 60 2.80E-07 2.10E-07 2.90E-07 1.80E-07 2.50E-07 2.40E-07 2.30E-07 2.60E-07 2.30E-07 1.50E-07 3.70E-07 3.80E-07 70 2.80E-07 2.10E-07 3.00E-07 1.80E-07 2.50E-07 2.30E-07 2.30E-07 2.60E-07 2.30E-07 1.50E-07 3.70E-07 3.80E-07 75 2.80E-07 2.10E-07 3.00E-07 1.80E-07 2.50E-07 2.30E-07 2.30E-07 2.60E-07 2.30E-07 1.50E-07 3.70E-07 3.80E-07 100 2.70E-07 2.10E-07 3.00E-07 1.80E-07 2.50E-07 2.20E-07 2.20E-07 2.60E-07 2.20E-07 1.40E-07 3.70E-07 3.80E-07 200 1.00E-07 3.00E-08 1.20E-07 7.00E-08 9.00E-08 -2.00E-08 2.00E-08 1.00E-07 5.00E-08 -4.00E-08 3.70E-07 3.80E-07 3.29E-07 4.89E-08 4.30E-07 2.28E-07 -4.00E-06 PASS 4.00E-06 PASS 2.94E-07 4.79E-08 3.93E-07 1.95E-07 -5.00E-06 PASS 5.00E-06 PASS 2.73E-07 4.67E-08 3.69E-07 1.77E-07 -5.00E-06 PASS 5.00E-06 PASS 2.58E-07 4.85E-08 3.58E-07 1.58E-07 -5.00E-06 PASS 5.00E-06 PASS 2.46E-07 4.35E-08 3.36E-07 1.56E-07 -5.00E-06 PASS 5.00E-06 PASS 2.37E-07 4.37E-08 3.27E-07 1.47E-07 -7.50E-06 PASS 7.50E-06 PASS 2.32E-07 4.32E-08 3.21E-07 1.43E-07 -7.50E-06 PASS 7.50E-06 PASS 2.32E-07 4.47E-08 3.24E-07 1.40E-07 -7.50E-06 PASS 7.50E-06 PASS 2.32E-07 4.47E-08 3.24E-07 1.40E-07 -7.50E-06 PASS 7.50E-06 PASS 2.27E-07 4.60E-08 3.22E-07 1.32E-07 -1.00E-05 PASS 1.00E-05 PASS 5.20E-08 5.39E-08 1.63E-07 -5.93E-08 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 32 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @+/-5V #4 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.14. Plot of Positive Input Bias Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 33 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.14. Raw data for Positive Input Bias Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.50E-07 3.70E-07 2.90E-07 3.50E-07 3.00E-07 3.70E-07 4.10E-07 3.90E-07 3.60E-07 3.50E-07 3.50E-07 3.50E-07 10 3.20E-07 3.40E-07 2.60E-07 3.10E-07 2.70E-07 3.20E-07 3.70E-07 3.70E-07 3.20E-07 3.00E-07 3.50E-07 3.40E-07 20 2.90E-07 3.20E-07 2.40E-07 2.90E-07 2.50E-07 2.90E-07 3.50E-07 3.60E-07 2.90E-07 2.70E-07 3.50E-07 3.40E-07 30 2.70E-07 3.00E-07 2.20E-07 2.70E-07 2.40E-07 2.70E-07 3.40E-07 3.60E-07 2.60E-07 2.50E-07 3.50E-07 3.40E-07 40 2.50E-07 2.90E-07 2.10E-07 2.60E-07 2.30E-07 2.60E-07 3.20E-07 3.60E-07 2.50E-07 2.30E-07 3.50E-07 3.50E-07 50 2.30E-07 2.80E-07 2.00E-07 2.40E-07 2.20E-07 2.50E-07 3.10E-07 3.60E-07 2.40E-07 2.20E-07 3.50E-07 3.50E-07 60 2.20E-07 2.70E-07 1.90E-07 2.30E-07 2.20E-07 2.40E-07 3.10E-07 3.60E-07 2.30E-07 2.20E-07 3.50E-07 3.40E-07 70 2.10E-07 2.60E-07 1.90E-07 2.30E-07 2.20E-07 2.30E-07 3.10E-07 3.70E-07 2.20E-07 2.20E-07 3.50E-07 3.40E-07 75 2.10E-07 2.70E-07 1.90E-07 2.30E-07 2.20E-07 2.30E-07 3.10E-07 3.80E-07 2.30E-07 2.20E-07 3.50E-07 3.50E-07 100 2.00E-07 2.60E-07 1.80E-07 2.30E-07 2.30E-07 2.20E-07 3.00E-07 3.90E-07 2.00E-07 2.10E-07 3.50E-07 3.50E-07 200 -6.00E-08 7.00E-08 -2.00E-08 2.00E-08 8.00E-08 -2.00E-08 1.20E-07 3.80E-07 -3.00E-08 -4.00E-08 3.50E-07 3.50E-07 3.54E-07 3.66E-08 4.30E-07 2.78E-07 -4.00E-06 PASS 4.00E-06 PASS 3.18E-07 3.65E-08 3.93E-07 2.43E-07 -5.00E-06 PASS 5.00E-06 PASS 2.95E-07 3.89E-08 3.75E-07 2.15E-07 -5.00E-06 PASS 5.00E-06 PASS 2.78E-07 4.37E-08 3.68E-07 1.88E-07 -5.00E-06 PASS 5.00E-06 PASS 2.66E-07 4.55E-08 3.60E-07 1.72E-07 -5.00E-06 PASS 5.00E-06 PASS 2.55E-07 4.86E-08 3.55E-07 1.55E-07 -7.50E-06 PASS 7.50E-06 PASS 2.49E-07 5.09E-08 3.54E-07 1.44E-07 -7.50E-06 PASS 7.50E-06 PASS 2.46E-07 5.44E-08 3.58E-07 1.34E-07 -7.50E-06 PASS 7.50E-06 PASS 2.49E-07 5.69E-08 3.66E-07 1.32E-07 -7.50E-06 PASS 7.50E-06 PASS 2.42E-07 6.21E-08 3.70E-07 1.14E-07 -1.00E-05 PASS 1.00E-05 PASS 5.00E-08 1.30E-07 3.19E-07 -2.19E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 34 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @+/-5V #1 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.15. Plot of Negative Input Bias Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 35 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.15. Raw data for Negative Input Bias Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.90E-07 3.50E-07 2.70E-07 3.10E-07 3.00E-07 3.80E-07 4.00E-07 3.80E-07 3.50E-07 3.60E-07 3.20E-07 3.40E-07 10 3.50E-07 3.00E-07 2.20E-07 2.80E-07 2.60E-07 3.40E-07 3.60E-07 3.30E-07 2.90E-07 3.00E-07 3.20E-07 3.40E-07 20 3.30E-07 2.50E-07 1.80E-07 2.50E-07 2.40E-07 3.20E-07 3.40E-07 3.00E-07 2.50E-07 2.60E-07 3.20E-07 3.40E-07 30 3.20E-07 2.30E-07 1.50E-07 2.20E-07 2.30E-07 3.00E-07 3.30E-07 2.80E-07 2.20E-07 2.30E-07 3.20E-07 3.40E-07 40 3.00E-07 2.00E-07 1.20E-07 2.10E-07 2.20E-07 3.00E-07 3.20E-07 2.60E-07 2.00E-07 1.90E-07 3.20E-07 3.40E-07 50 3.00E-07 1.70E-07 1.00E-07 1.90E-07 2.20E-07 2.90E-07 3.20E-07 2.50E-07 1.80E-07 1.70E-07 3.20E-07 3.40E-07 60 2.90E-07 1.60E-07 8.00E-08 1.80E-07 2.20E-07 2.90E-07 3.10E-07 2.40E-07 1.60E-07 1.50E-07 3.20E-07 3.40E-07 70 2.90E-07 1.50E-07 6.00E-08 1.70E-07 2.20E-07 2.90E-07 3.20E-07 2.40E-07 1.50E-07 1.40E-07 3.20E-07 3.40E-07 75 3.00E-07 1.50E-07 6.00E-08 1.70E-07 2.30E-07 2.90E-07 3.20E-07 2.30E-07 1.40E-07 1.40E-07 3.20E-07 3.40E-07 100 2.80E-07 1.10E-07 2.00E-08 1.20E-07 2.30E-07 2.80E-07 3.10E-07 2.10E-07 1.00E-07 1.00E-07 3.20E-07 3.40E-07 200 1.50E-07 -1.60E-07 -3.00E-07 -4.00E-08 1.50E-07 1.60E-07 2.00E-07 -3.00E-08 -2.10E-07 -2.20E-07 3.20E-07 3.40E-07 3.49E-07 4.28E-08 4.37E-07 2.61E-07 -4.00E-06 PASS 4.00E-06 PASS 3.03E-07 4.35E-08 3.93E-07 2.13E-07 -5.00E-06 PASS 5.00E-06 PASS 2.72E-07 4.96E-08 3.74E-07 1.70E-07 -5.00E-06 PASS 5.00E-06 PASS 2.51E-07 5.55E-08 3.66E-07 1.36E-07 -5.00E-06 PASS 5.00E-06 PASS 2.32E-07 6.21E-08 3.60E-07 1.04E-07 -5.00E-06 PASS 5.00E-06 PASS 2.19E-07 7.00E-08 3.64E-07 7.45E-08 -7.50E-06 PASS 7.50E-06 PASS 2.08E-07 7.47E-08 3.62E-07 5.38E-08 -7.50E-06 PASS 7.50E-06 PASS 2.03E-07 8.27E-08 3.74E-07 3.21E-08 -7.50E-06 PASS 7.50E-06 PASS 2.03E-07 8.46E-08 3.78E-07 2.83E-08 -7.50E-06 PASS 7.50E-06 PASS 1.76E-07 9.83E-08 3.79E-07 -2.71E-08 -1.00E-05 PASS 1.00E-05 PASS -3.00E-08 1.86E-07 3.55E-07 -4.15E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 36 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @+/-5V #2 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.16. Plot of Negative Input Bias Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 37 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.16. Raw data for Negative Input Bias Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.60E-07 3.50E-07 3.70E-07 2.50E-07 3.40E-07 3.70E-07 3.20E-07 3.50E-07 3.20E-07 2.70E-07 3.80E-07 3.80E-07 10 3.40E-07 3.00E-07 3.30E-07 2.20E-07 2.90E-07 3.00E-07 2.70E-07 2.90E-07 2.60E-07 2.40E-07 3.80E-07 3.80E-07 20 3.20E-07 2.60E-07 3.10E-07 1.70E-07 2.40E-07 2.50E-07 2.20E-07 2.50E-07 2.20E-07 2.20E-07 3.80E-07 3.80E-07 30 3.10E-07 2.20E-07 3.00E-07 1.30E-07 2.10E-07 2.10E-07 1.90E-07 2.10E-07 1.80E-07 2.10E-07 3.80E-07 3.80E-07 40 3.00E-07 2.00E-07 3.00E-07 9.00E-08 1.80E-07 1.70E-07 1.70E-07 1.80E-07 1.50E-07 2.10E-07 3.80E-07 3.80E-07 50 3.00E-07 1.70E-07 2.90E-07 6.00E-08 1.60E-07 1.40E-07 1.50E-07 1.50E-07 1.20E-07 2.00E-07 3.80E-07 3.80E-07 60 3.00E-07 1.50E-07 2.90E-07 3.00E-08 1.40E-07 1.10E-07 1.20E-07 1.30E-07 1.00E-07 2.00E-07 3.80E-07 3.80E-07 70 3.00E-07 1.30E-07 2.90E-07 0.00E+00 1.30E-07 8.00E-08 1.10E-07 1.10E-07 9.00E-08 2.00E-07 3.80E-07 3.80E-07 75 3.10E-07 1.30E-07 2.90E-07 -2.00E-08 1.30E-07 8.00E-08 1.10E-07 1.00E-07 8.00E-08 2.10E-07 3.80E-07 3.80E-07 100 3.00E-07 8.00E-08 2.90E-07 -1.00E-07 9.00E-08 2.00E-08 7.00E-08 5.00E-08 4.00E-08 2.00E-07 3.80E-07 3.80E-07 200 2.40E-07 -2.50E-07 1.70E-07 -4.10E-07 -2.20E-07 -3.80E-07 -2.60E-07 -3.10E-07 -3.10E-07 1.00E-07 3.80E-07 3.80E-07 3.30E-07 4.11E-08 4.15E-07 2.45E-07 -4.00E-06 PASS 4.00E-06 PASS 2.84E-07 3.75E-08 3.61E-07 2.07E-07 -5.00E-06 PASS 5.00E-06 PASS 2.46E-07 4.43E-08 3.37E-07 1.55E-07 -5.00E-06 PASS 5.00E-06 PASS 2.17E-07 5.31E-08 3.27E-07 1.07E-07 -5.00E-06 PASS 5.00E-06 PASS 1.95E-07 6.42E-08 3.27E-07 6.25E-08 -5.00E-06 PASS 5.00E-06 PASS 1.74E-07 7.34E-08 3.25E-07 2.25E-08 -7.50E-06 PASS 7.50E-06 PASS 1.57E-07 8.43E-08 3.31E-07 -1.71E-08 -7.50E-06 PASS 7.50E-06 PASS 1.44E-07 9.38E-08 3.38E-07 -4.98E-08 -7.50E-06 PASS 7.50E-06 PASS 1.42E-07 1.01E-07 3.51E-07 -6.65E-08 -7.50E-06 PASS 7.50E-06 PASS 1.04E-07 1.25E-07 3.61E-07 -1.53E-07 -1.00E-05 PASS 1.00E-05 PASS -1.63E-07 2.39E-07 3.30E-07 -6.56E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 38 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @+/-5V #3 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.17. Plot of Negative Input Bias Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 39 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.17. Raw data for Negative Input Bias Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.90E-07 3.30E-07 3.70E-07 2.40E-07 3.40E-07 3.90E-07 3.20E-07 3.50E-07 3.20E-07 2.70E-07 3.60E-07 3.80E-07 10 3.60E-07 2.80E-07 3.20E-07 2.10E-07 2.90E-07 3.50E-07 2.70E-07 3.20E-07 2.90E-07 2.30E-07 3.60E-07 3.70E-07 20 3.40E-07 2.40E-07 2.80E-07 1.70E-07 2.40E-07 3.30E-07 2.30E-07 3.00E-07 2.80E-07 2.10E-07 3.60E-07 3.70E-07 30 3.20E-07 2.10E-07 2.50E-07 1.30E-07 2.10E-07 3.10E-07 2.00E-07 3.00E-07 2.70E-07 2.00E-07 3.60E-07 3.80E-07 40 3.10E-07 1.80E-07 2.20E-07 1.00E-07 1.80E-07 3.10E-07 1.70E-07 2.90E-07 2.60E-07 1.90E-07 3.60E-07 3.80E-07 50 3.10E-07 1.60E-07 2.00E-07 7.00E-08 1.60E-07 3.00E-07 1.50E-07 2.90E-07 2.60E-07 1.90E-07 3.60E-07 3.80E-07 60 3.10E-07 1.40E-07 1.80E-07 4.00E-08 1.40E-07 3.00E-07 1.20E-07 2.90E-07 2.70E-07 1.90E-07 3.60E-07 3.80E-07 70 3.10E-07 1.20E-07 1.60E-07 1.00E-08 1.30E-07 3.00E-07 1.10E-07 2.90E-07 2.70E-07 1.90E-07 3.60E-07 3.70E-07 75 3.10E-07 1.20E-07 1.60E-07 0.00E+00 1.30E-07 3.00E-07 1.10E-07 3.00E-07 2.70E-07 2.00E-07 3.60E-07 3.80E-07 100 3.00E-07 8.00E-08 1.20E-07 -7.00E-08 1.00E-07 2.90E-07 7.00E-08 2.90E-07 2.70E-07 2.00E-07 3.60E-07 3.80E-07 200 1.80E-07 -2.30E-07 -2.00E-07 -3.30E-07 -2.00E-07 1.60E-07 -2.60E-07 2.30E-07 2.20E-07 9.00E-08 3.60E-07 3.80E-07 3.32E-07 4.85E-08 4.32E-07 2.32E-07 -4.00E-06 PASS 4.00E-06 PASS 2.92E-07 4.80E-08 3.91E-07 1.93E-07 -5.00E-06 PASS 5.00E-06 PASS 2.62E-07 5.37E-08 3.73E-07 1.51E-07 -5.00E-06 PASS 5.00E-06 PASS 2.40E-07 6.06E-08 3.65E-07 1.15E-07 -5.00E-06 PASS 5.00E-06 PASS 2.21E-07 6.97E-08 3.65E-07 7.71E-08 -5.00E-06 PASS 5.00E-06 PASS 2.09E-07 7.87E-08 3.71E-07 4.66E-08 -7.50E-06 PASS 7.50E-06 PASS 1.98E-07 9.11E-08 3.86E-07 9.79E-09 -7.50E-06 PASS 7.50E-06 PASS 1.89E-07 1.01E-07 3.97E-07 -1.87E-08 -7.50E-06 PASS 7.50E-06 PASS 1.90E-07 1.04E-07 4.04E-07 -2.44E-08 -7.50E-06 PASS 7.50E-06 PASS 1.65E-07 1.24E-07 4.22E-07 -9.20E-08 -1.00E-05 PASS 1.00E-05 PASS -3.40E-08 2.27E-07 4.36E-07 -5.04E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 40 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @+/-5V #4 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.18. Plot of Negative Input Bias Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 41 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.18. Raw data for Negative Input Bias Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 3.60E-07 3.70E-07 3.10E-07 3.50E-07 3.00E-07 3.90E-07 3.80E-07 3.60E-07 3.60E-07 3.60E-07 3.60E-07 3.30E-07 10 3.20E-07 3.30E-07 2.70E-07 3.30E-07 2.50E-07 3.40E-07 3.30E-07 3.10E-07 3.00E-07 3.00E-07 3.50E-07 3.30E-07 20 2.90E-07 3.10E-07 2.40E-07 3.10E-07 2.30E-07 3.10E-07 2.90E-07 2.70E-07 2.50E-07 2.50E-07 3.50E-07 3.30E-07 30 2.80E-07 3.00E-07 2.30E-07 3.00E-07 2.00E-07 3.00E-07 2.70E-07 2.40E-07 2.10E-07 2.10E-07 3.50E-07 3.30E-07 40 2.60E-07 2.90E-07 2.30E-07 2.80E-07 1.90E-07 2.90E-07 2.50E-07 2.10E-07 1.80E-07 1.80E-07 3.50E-07 3.30E-07 50 2.50E-07 2.80E-07 2.20E-07 2.80E-07 1.80E-07 2.70E-07 2.40E-07 2.00E-07 1.50E-07 1.50E-07 3.50E-07 3.30E-07 60 2.40E-07 2.80E-07 2.20E-07 2.70E-07 1.70E-07 2.70E-07 2.20E-07 1.70E-07 1.30E-07 1.20E-07 3.50E-07 3.30E-07 70 2.40E-07 2.80E-07 2.10E-07 2.60E-07 1.60E-07 2.60E-07 2.10E-07 1.60E-07 1.10E-07 1.10E-07 3.50E-07 3.30E-07 75 2.40E-07 2.80E-07 2.20E-07 2.70E-07 1.60E-07 2.60E-07 2.10E-07 1.60E-07 1.00E-07 1.10E-07 3.50E-07 3.40E-07 100 2.20E-07 2.70E-07 2.00E-07 2.40E-07 1.50E-07 2.50E-07 1.80E-07 1.10E-07 5.00E-08 6.00E-08 3.50E-07 3.30E-07 200 5.00E-08 1.40E-07 5.00E-08 1.60E-07 -3.00E-08 6.00E-08 -8.00E-08 -2.10E-07 -3.00E-07 -2.90E-07 3.50E-07 3.30E-07 3.54E-07 2.84E-08 4.13E-07 2.95E-07 -4.00E-06 PASS 4.00E-06 PASS 3.08E-07 2.90E-08 3.68E-07 2.48E-07 -5.00E-06 PASS 5.00E-06 PASS 2.75E-07 3.10E-08 3.39E-07 2.11E-07 -5.00E-06 PASS 5.00E-06 PASS 2.54E-07 4.06E-08 3.38E-07 1.70E-07 -5.00E-06 PASS 5.00E-06 PASS 2.36E-07 4.43E-08 3.27E-07 1.45E-07 -5.00E-06 PASS 5.00E-06 PASS 2.22E-07 5.03E-08 3.26E-07 1.18E-07 -7.50E-06 PASS 7.50E-06 PASS 2.09E-07 5.86E-08 3.30E-07 8.80E-08 -7.50E-06 PASS 7.50E-06 PASS 2.00E-07 6.22E-08 3.28E-07 7.16E-08 -7.50E-06 PASS 7.50E-06 PASS 2.01E-07 6.52E-08 3.36E-07 6.63E-08 -7.50E-06 PASS 7.50E-06 PASS 1.73E-07 7.83E-08 3.35E-07 1.13E-08 -1.00E-05 PASS 1.00E-05 PASS -4.50E-08 1.70E-07 3.05E-07 -3.95E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 42 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @+/-5V #1 (dB) 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.19. Plot of Common Mode Rejection Ratio @+/-5V #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 43 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.19. Raw data for Common Mode Rejection Ratio @+/-5V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @+/-5V #1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.59E+01 8.87E+01 8.45E+01 8.63E+01 8.40E+01 8.67E+01 8.48E+01 8.58E+01 8.53E+01 8.64E+01 8.57E+01 8.42E+01 10 8.48E+01 8.82E+01 8.33E+01 8.61E+01 8.36E+01 8.59E+01 8.39E+01 8.46E+01 8.44E+01 8.60E+01 8.57E+01 8.43E+01 20 8.51E+01 8.79E+01 8.36E+01 8.60E+01 8.36E+01 8.60E+01 8.41E+01 8.50E+01 8.46E+01 8.58E+01 8.57E+01 8.43E+01 30 8.53E+01 8.79E+01 8.39E+01 8.59E+01 8.36E+01 8.60E+01 8.42E+01 8.51E+01 8.47E+01 8.58E+01 8.57E+01 8.43E+01 40 8.53E+01 8.77E+01 8.39E+01 8.58E+01 8.35E+01 8.59E+01 8.43E+01 8.51E+01 8.47E+01 8.56E+01 8.57E+01 8.42E+01 50 8.53E+01 8.76E+01 8.39E+01 8.56E+01 8.34E+01 8.59E+01 8.42E+01 8.51E+01 8.47E+01 8.55E+01 8.57E+01 8.42E+01 60 8.53E+01 8.74E+01 8.38E+01 8.55E+01 8.33E+01 8.58E+01 8.42E+01 8.49E+01 8.46E+01 8.54E+01 8.57E+01 8.42E+01 70 8.52E+01 8.73E+01 8.37E+01 8.53E+01 8.32E+01 8.57E+01 8.40E+01 8.48E+01 8.45E+01 8.52E+01 8.57E+01 8.42E+01 75 8.52E+01 8.72E+01 8.36E+01 8.52E+01 8.31E+01 8.56E+01 8.40E+01 8.48E+01 8.44E+01 8.51E+01 8.57E+01 8.43E+01 100 8.50E+01 8.67E+01 8.33E+01 8.48E+01 8.28E+01 8.52E+01 8.37E+01 8.44E+01 8.41E+01 8.47E+01 8.57E+01 8.43E+01 200 8.36E+01 8.46E+01 8.18E+01 8.35E+01 8.16E+01 8.36E+01 8.25E+01 8.28E+01 8.27E+01 8.31E+01 8.57E+01 8.42E+01 8.58E+01 1.35E+00 8.86E+01 8.30E+01 7.50E+01 PASS 8.51E+01 1.48E+00 8.81E+01 8.20E+01 7.30E+01 PASS 8.52E+01 1.31E+00 8.79E+01 8.25E+01 7.30E+01 PASS 8.52E+01 1.27E+00 8.78E+01 8.26E+01 7.30E+01 PASS 8.52E+01 1.22E+00 8.77E+01 8.27E+01 7.30E+01 PASS 8.51E+01 1.20E+00 8.76E+01 8.26E+01 6.20E+01 PASS 8.50E+01 1.16E+00 8.74E+01 8.26E+01 6.20E+01 PASS 8.49E+01 1.16E+00 8.73E+01 8.25E+01 6.20E+01 PASS 8.48E+01 1.14E+00 8.71E+01 8.24E+01 6.20E+01 PASS 8.45E+01 1.09E+00 8.67E+01 8.22E+01 6.20E+01 PASS 8.30E+01 9.00E-01 8.48E+01 8.11E+01 6.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 44 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @+/-5V #2 (dB) 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.20. Plot of Common Mode Rejection Ratio @+/-5V #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 45 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.20. Raw data for Common Mode Rejection Ratio @+/-5V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @+/-5V #2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.62E+01 8.33E+01 8.45E+01 8.64E+01 8.74E+01 8.47E+01 8.49E+01 8.57E+01 8.50E+01 8.56E+01 8.60E+01 8.56E+01 10 8.56E+01 8.26E+01 8.29E+01 8.63E+01 8.67E+01 8.35E+01 8.43E+01 8.48E+01 8.42E+01 8.36E+01 8.60E+01 8.56E+01 20 8.56E+01 8.27E+01 8.36E+01 8.61E+01 8.67E+01 8.39E+01 8.43E+01 8.49E+01 8.43E+01 8.48E+01 8.60E+01 8.56E+01 30 8.55E+01 8.28E+01 8.39E+01 8.60E+01 8.66E+01 8.41E+01 8.43E+01 8.50E+01 8.44E+01 8.53E+01 8.60E+01 8.56E+01 40 8.56E+01 8.28E+01 8.41E+01 8.59E+01 8.67E+01 8.41E+01 8.43E+01 8.51E+01 8.44E+01 8.55E+01 8.60E+01 8.56E+01 50 8.55E+01 8.28E+01 8.41E+01 8.57E+01 8.65E+01 8.41E+01 8.43E+01 8.50E+01 8.43E+01 8.56E+01 8.60E+01 8.57E+01 60 8.55E+01 8.27E+01 8.42E+01 8.56E+01 8.64E+01 8.40E+01 8.42E+01 8.50E+01 8.43E+01 8.56E+01 8.60E+01 8.57E+01 70 8.54E+01 8.26E+01 8.40E+01 8.54E+01 8.62E+01 8.40E+01 8.41E+01 8.48E+01 8.41E+01 8.54E+01 8.60E+01 8.56E+01 75 8.53E+01 8.26E+01 8.40E+01 8.53E+01 8.61E+01 8.38E+01 8.40E+01 8.47E+01 8.41E+01 8.54E+01 8.60E+01 8.56E+01 100 8.50E+01 8.24E+01 8.38E+01 8.50E+01 8.58E+01 8.36E+01 8.37E+01 8.45E+01 8.38E+01 8.51E+01 8.60E+01 8.56E+01 200 8.35E+01 8.11E+01 8.26E+01 8.35E+01 8.40E+01 8.22E+01 8.24E+01 8.29E+01 8.23E+01 8.37E+01 8.60E+01 8.56E+01 8.54E+01 1.16E+00 8.78E+01 8.30E+01 7.50E+01 PASS 8.45E+01 1.39E+00 8.73E+01 8.16E+01 7.30E+01 PASS 8.47E+01 1.20E+00 8.72E+01 8.22E+01 7.30E+01 PASS 8.48E+01 1.12E+00 8.71E+01 8.25E+01 7.30E+01 PASS 8.49E+01 1.10E+00 8.71E+01 8.26E+01 7.30E+01 PASS 8.48E+01 1.08E+00 8.70E+01 8.26E+01 6.20E+01 PASS 8.47E+01 1.06E+00 8.69E+01 8.25E+01 6.20E+01 PASS 8.46E+01 1.04E+00 8.67E+01 8.24E+01 6.20E+01 PASS 8.45E+01 1.04E+00 8.67E+01 8.24E+01 6.20E+01 PASS 8.43E+01 9.83E-01 8.63E+01 8.22E+01 6.20E+01 PASS 8.28E+01 8.75E-01 8.46E+01 8.10E+01 6.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 46 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @+/-5V #3 (dB) 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.21. Plot of Common Mode Rejection Ratio @+/-5V #3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 47 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.21. Raw data for Common Mode Rejection Ratio @+/-5V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @+/-5V #3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.62E+01 8.51E+01 8.56E+01 8.47E+01 8.57E+01 8.51E+01 8.72E+01 8.47E+01 8.54E+01 8.54E+01 8.54E+01 8.76E+01 10 8.54E+01 8.41E+01 8.48E+01 8.46E+01 8.52E+01 8.33E+01 8.62E+01 8.31E+01 8.38E+01 8.41E+01 8.55E+01 8.75E+01 20 8.54E+01 8.43E+01 8.49E+01 8.46E+01 8.52E+01 8.44E+01 8.63E+01 8.37E+01 8.44E+01 8.46E+01 8.55E+01 8.75E+01 30 8.55E+01 8.44E+01 8.49E+01 8.44E+01 8.51E+01 8.49E+01 8.65E+01 8.42E+01 8.48E+01 8.49E+01 8.55E+01 8.76E+01 40 8.55E+01 8.44E+01 8.49E+01 8.43E+01 8.50E+01 8.52E+01 8.65E+01 8.44E+01 8.50E+01 8.49E+01 8.54E+01 8.75E+01 50 8.55E+01 8.44E+01 8.48E+01 8.42E+01 8.49E+01 8.52E+01 8.64E+01 8.44E+01 8.49E+01 8.49E+01 8.55E+01 8.76E+01 60 8.54E+01 8.42E+01 8.47E+01 8.41E+01 8.48E+01 8.51E+01 8.63E+01 8.44E+01 8.49E+01 8.48E+01 8.54E+01 8.76E+01 70 8.53E+01 8.41E+01 8.46E+01 8.40E+01 8.46E+01 8.51E+01 8.62E+01 8.43E+01 8.49E+01 8.48E+01 8.54E+01 8.76E+01 75 8.53E+01 8.40E+01 8.45E+01 8.39E+01 8.46E+01 8.50E+01 8.60E+01 8.42E+01 8.48E+01 8.46E+01 8.55E+01 8.76E+01 100 8.49E+01 8.38E+01 8.42E+01 8.36E+01 8.42E+01 8.47E+01 8.57E+01 8.40E+01 8.45E+01 8.44E+01 8.55E+01 8.76E+01 200 8.34E+01 8.23E+01 8.25E+01 8.24E+01 8.27E+01 8.33E+01 8.40E+01 8.28E+01 8.32E+01 8.30E+01 8.54E+01 8.76E+01 8.55E+01 7.53E-01 8.71E+01 8.39E+01 7.50E+01 PASS 8.45E+01 9.60E-01 8.64E+01 8.25E+01 7.30E+01 PASS 8.48E+01 7.11E-01 8.62E+01 8.33E+01 7.30E+01 PASS 8.49E+01 6.52E-01 8.63E+01 8.36E+01 7.30E+01 PASS 8.50E+01 6.38E-01 8.63E+01 8.37E+01 7.30E+01 PASS 8.50E+01 6.43E-01 8.63E+01 8.36E+01 6.20E+01 PASS 8.49E+01 6.42E-01 8.62E+01 8.35E+01 6.20E+01 PASS 8.48E+01 6.30E-01 8.61E+01 8.35E+01 6.20E+01 PASS 8.47E+01 6.25E-01 8.60E+01 8.34E+01 6.20E+01 PASS 8.44E+01 6.04E-01 8.56E+01 8.31E+01 6.20E+01 PASS 8.29E+01 5.29E-01 8.40E+01 8.18E+01 6.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 48 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @+/-5V #4 (dB) 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.22. Plot of Common Mode Rejection Ratio @+/-5V #4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 49 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.22. Raw data for Common Mode Rejection Ratio @+/-5V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @+/-5V #4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.51E+01 8.59E+01 8.63E+01 8.73E+01 8.58E+01 8.53E+01 8.65E+01 8.59E+01 8.67E+01 8.53E+01 8.68E+01 8.64E+01 10 8.38E+01 8.50E+01 8.44E+01 8.72E+01 8.52E+01 8.46E+01 8.59E+01 8.49E+01 8.55E+01 8.48E+01 8.68E+01 8.64E+01 20 8.42E+01 8.51E+01 8.50E+01 8.70E+01 8.53E+01 8.46E+01 8.58E+01 8.51E+01 8.58E+01 8.48E+01 8.68E+01 8.64E+01 30 8.44E+01 8.52E+01 8.54E+01 8.70E+01 8.53E+01 8.46E+01 8.58E+01 8.52E+01 8.59E+01 8.47E+01 8.68E+01 8.64E+01 40 8.46E+01 8.52E+01 8.57E+01 8.69E+01 8.52E+01 8.46E+01 8.58E+01 8.53E+01 8.59E+01 8.47E+01 8.68E+01 8.63E+01 50 8.46E+01 8.53E+01 8.57E+01 8.67E+01 8.51E+01 8.46E+01 8.58E+01 8.52E+01 8.59E+01 8.45E+01 8.68E+01 8.64E+01 60 8.46E+01 8.52E+01 8.57E+01 8.66E+01 8.50E+01 8.45E+01 8.57E+01 8.51E+01 8.58E+01 8.44E+01 8.68E+01 8.64E+01 70 8.45E+01 8.51E+01 8.56E+01 8.64E+01 8.49E+01 8.44E+01 8.56E+01 8.50E+01 8.57E+01 8.42E+01 8.68E+01 8.64E+01 75 8.44E+01 8.50E+01 8.55E+01 8.63E+01 8.48E+01 8.42E+01 8.55E+01 8.49E+01 8.56E+01 8.42E+01 8.68E+01 8.64E+01 100 8.42E+01 8.48E+01 8.53E+01 8.59E+01 8.45E+01 8.40E+01 8.53E+01 8.47E+01 8.52E+01 8.38E+01 8.68E+01 8.63E+01 200 8.30E+01 8.33E+01 8.39E+01 8.45E+01 8.32E+01 8.25E+01 8.38E+01 8.32E+01 8.36E+01 8.24E+01 8.68E+01 8.64E+01 8.60E+01 6.93E-01 8.74E+01 8.46E+01 7.50E+01 PASS 8.51E+01 9.31E-01 8.71E+01 8.32E+01 7.30E+01 PASS 8.53E+01 7.83E-01 8.69E+01 8.36E+01 7.30E+01 PASS 8.54E+01 7.56E-01 8.69E+01 8.38E+01 7.30E+01 PASS 8.54E+01 7.08E-01 8.68E+01 8.39E+01 7.30E+01 PASS 8.53E+01 6.95E-01 8.68E+01 8.39E+01 6.20E+01 PASS 8.52E+01 6.88E-01 8.67E+01 8.38E+01 6.20E+01 PASS 8.51E+01 6.75E-01 8.65E+01 8.37E+01 6.20E+01 PASS 8.50E+01 6.82E-01 8.64E+01 8.36E+01 6.20E+01 PASS 8.48E+01 6.71E-01 8.62E+01 8.34E+01 6.20E+01 PASS 8.33E+01 6.46E-01 8.47E+01 8.20E+01 6.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 50 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.00E+02 Power Supply Rejection Ratio #1 (dB) 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.23. Plot of Power Supply Rejection Ratio #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 51 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.23. Raw data for Power Supply Rejection Ratio #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio #1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.50E+01 1.01E+02 1.03E+02 9.15E+01 9.32E+01 9.62E+01 9.73E+01 9.69E+01 9.74E+01 9.80E+01 9.95E+01 9.63E+01 10 9.51E+01 1.01E+02 1.03E+02 9.16E+01 9.32E+01 9.64E+01 9.72E+01 9.70E+01 9.73E+01 9.77E+01 9.95E+01 9.65E+01 20 9.52E+01 1.01E+02 1.02E+02 9.17E+01 9.33E+01 9.65E+01 9.74E+01 9.70E+01 9.72E+01 9.77E+01 9.95E+01 9.65E+01 30 9.53E+01 1.01E+02 1.02E+02 9.18E+01 9.32E+01 9.65E+01 9.73E+01 9.71E+01 9.72E+01 9.76E+01 9.95E+01 9.64E+01 40 9.53E+01 1.01E+02 1.02E+02 9.19E+01 9.33E+01 9.67E+01 9.74E+01 9.70E+01 9.71E+01 9.77E+01 9.95E+01 9.65E+01 50 9.56E+01 1.01E+02 1.02E+02 9.19E+01 9.33E+01 9.68E+01 9.75E+01 9.70E+01 9.70E+01 9.76E+01 9.94E+01 9.65E+01 60 9.57E+01 1.01E+02 1.02E+02 9.19E+01 9.32E+01 9.69E+01 9.75E+01 9.69E+01 9.67E+01 9.75E+01 9.95E+01 9.64E+01 70 9.57E+01 1.01E+02 1.01E+02 9.21E+01 9.32E+01 9.72E+01 9.75E+01 9.69E+01 9.67E+01 9.74E+01 9.94E+01 9.65E+01 75 9.58E+01 1.00E+02 1.01E+02 9.21E+01 9.32E+01 9.70E+01 9.74E+01 9.69E+01 9.66E+01 9.74E+01 9.95E+01 9.64E+01 100 9.58E+01 1.00E+02 1.00E+02 9.24E+01 9.30E+01 9.73E+01 9.73E+01 9.67E+01 9.62E+01 9.72E+01 9.94E+01 9.64E+01 200 9.70E+01 9.90E+01 9.83E+01 9.37E+01 9.35E+01 9.86E+01 9.69E+01 9.64E+01 9.56E+01 9.74E+01 9.93E+01 9.65E+01 9.70E+01 3.37E+00 1.04E+02 9.00E+01 7.80E+01 PASS 9.69E+01 3.28E+00 1.04E+02 9.02E+01 7.70E+01 PASS 9.70E+01 3.21E+00 1.04E+02 9.03E+01 7.50E+01 PASS 9.69E+01 3.17E+00 1.03E+02 9.04E+01 7.50E+01 PASS 9.70E+01 3.12E+00 1.03E+02 9.05E+01 7.50E+01 PASS 9.70E+01 3.03E+00 1.03E+02 9.07E+01 6.50E+01 PASS 9.69E+01 2.92E+00 1.03E+02 9.08E+01 6.50E+01 PASS 9.68E+01 2.78E+00 1.03E+02 9.11E+01 6.50E+01 PASS 9.68E+01 2.73E+00 1.02E+02 9.12E+01 6.50E+01 PASS 9.66E+01 2.52E+00 1.02E+02 9.14E+01 6.50E+01 PASS 9.66E+01 1.90E+00 1.01E+02 9.27E+01 6.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 52 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.00E+02 Power Supply Rejection Ratio #2 (dB) 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.24. Plot of Power Supply Rejection Ratio #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 53 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.24. Raw data for Power Supply Rejection Ratio #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio #2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.00E+02 9.02E+01 9.93E+01 9.47E+01 9.68E+01 9.96E+01 9.06E+01 9.32E+01 9.40E+01 9.54E+01 9.89E+01 9.91E+01 10 1.01E+02 9.03E+01 9.92E+01 9.49E+01 9.69E+01 9.91E+01 9.07E+01 9.32E+01 9.39E+01 9.50E+01 9.90E+01 9.91E+01 20 1.01E+02 9.03E+01 9.91E+01 9.49E+01 9.68E+01 9.89E+01 9.07E+01 9.31E+01 9.39E+01 9.52E+01 9.89E+01 9.91E+01 30 1.01E+02 9.04E+01 9.89E+01 9.47E+01 9.70E+01 9.90E+01 9.08E+01 9.31E+01 9.39E+01 9.51E+01 9.89E+01 9.91E+01 40 1.01E+02 9.04E+01 9.90E+01 9.46E+01 9.70E+01 9.90E+01 9.09E+01 9.31E+01 9.39E+01 9.51E+01 9.88E+01 9.91E+01 50 1.01E+02 9.05E+01 9.89E+01 9.46E+01 9.69E+01 9.88E+01 9.10E+01 9.31E+01 9.40E+01 9.51E+01 9.88E+01 9.91E+01 60 1.01E+02 9.05E+01 9.89E+01 9.43E+01 9.69E+01 9.88E+01 9.10E+01 9.31E+01 9.39E+01 9.52E+01 9.89E+01 9.91E+01 70 1.01E+02 9.07E+01 9.89E+01 9.42E+01 9.68E+01 9.88E+01 9.11E+01 9.30E+01 9.41E+01 9.51E+01 9.89E+01 9.91E+01 75 1.01E+02 9.06E+01 9.88E+01 9.43E+01 9.69E+01 9.87E+01 9.12E+01 9.30E+01 9.40E+01 9.50E+01 9.88E+01 9.92E+01 100 1.01E+02 9.06E+01 9.85E+01 9.39E+01 9.66E+01 9.85E+01 9.13E+01 9.30E+01 9.40E+01 9.50E+01 9.89E+01 9.90E+01 200 1.00E+02 9.13E+01 9.82E+01 9.39E+01 9.69E+01 9.81E+01 9.23E+01 9.32E+01 9.45E+01 9.58E+01 9.88E+01 9.90E+01 9.54E+01 3.61E+00 1.03E+02 8.80E+01 7.80E+01 PASS 9.54E+01 3.53E+00 1.03E+02 8.81E+01 7.70E+01 PASS 9.54E+01 3.51E+00 1.03E+02 8.81E+01 7.50E+01 PASS 9.54E+01 3.50E+00 1.03E+02 8.81E+01 7.50E+01 PASS 9.54E+01 3.51E+00 1.03E+02 8.81E+01 7.50E+01 PASS 9.54E+01 3.46E+00 1.03E+02 8.82E+01 6.50E+01 PASS 9.53E+01 3.46E+00 1.02E+02 8.82E+01 6.50E+01 PASS 9.53E+01 3.40E+00 1.02E+02 8.83E+01 6.50E+01 PASS 9.53E+01 3.40E+00 1.02E+02 8.83E+01 6.50E+01 PASS 9.52E+01 3.30E+00 1.02E+02 8.84E+01 6.50E+01 PASS 9.55E+01 2.93E+00 1.02E+02 8.94E+01 6.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 54 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.00E+02 Power Supply Rejection Ratio #3 (dB) 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.25. Plot of Power Supply Rejection Ratio #3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 55 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.25. Raw data for Power Supply Rejection Ratio #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio #3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.70E+01 9.05E+01 9.78E+01 9.47E+01 9.83E+01 9.71E+01 9.81E+01 9.21E+01 1.01E+02 9.91E+01 9.90E+01 1.05E+02 10 9.70E+01 9.06E+01 9.78E+01 9.49E+01 9.84E+01 9.64E+01 9.80E+01 9.20E+01 1.01E+02 9.89E+01 9.91E+01 1.05E+02 20 9.70E+01 9.07E+01 9.78E+01 9.49E+01 9.85E+01 9.64E+01 9.79E+01 9.20E+01 1.01E+02 9.88E+01 9.90E+01 1.05E+02 30 9.71E+01 9.07E+01 9.77E+01 9.47E+01 9.85E+01 9.63E+01 9.80E+01 9.20E+01 1.01E+02 9.89E+01 9.90E+01 1.05E+02 40 9.72E+01 9.08E+01 9.78E+01 9.45E+01 9.84E+01 9.64E+01 9.80E+01 9.21E+01 1.01E+02 9.89E+01 9.91E+01 1.05E+02 50 9.72E+01 9.08E+01 9.75E+01 9.45E+01 9.85E+01 9.66E+01 9.79E+01 9.21E+01 1.01E+02 9.88E+01 9.91E+01 1.05E+02 60 9.72E+01 9.08E+01 9.76E+01 9.43E+01 9.86E+01 9.66E+01 9.79E+01 9.22E+01 1.01E+02 9.89E+01 9.90E+01 1.05E+02 70 9.72E+01 9.10E+01 9.74E+01 9.43E+01 9.83E+01 9.65E+01 9.77E+01 9.22E+01 1.01E+02 9.89E+01 9.89E+01 1.05E+02 75 9.72E+01 9.10E+01 9.74E+01 9.44E+01 9.84E+01 9.67E+01 9.77E+01 9.22E+01 1.01E+02 9.86E+01 9.90E+01 1.05E+02 100 9.72E+01 9.10E+01 9.70E+01 9.40E+01 9.81E+01 9.66E+01 9.75E+01 9.23E+01 1.01E+02 9.84E+01 9.89E+01 1.05E+02 200 9.71E+01 9.19E+01 9.67E+01 9.40E+01 9.81E+01 9.70E+01 9.71E+01 9.29E+01 1.01E+02 9.90E+01 9.89E+01 1.05E+02 9.66E+01 3.28E+00 1.03E+02 8.98E+01 7.80E+01 PASS 9.66E+01 3.28E+00 1.03E+02 8.98E+01 7.70E+01 PASS 9.65E+01 3.20E+00 1.03E+02 8.99E+01 7.50E+01 PASS 9.65E+01 3.23E+00 1.03E+02 8.99E+01 7.50E+01 PASS 9.65E+01 3.19E+00 1.03E+02 8.99E+01 7.50E+01 PASS 9.65E+01 3.23E+00 1.03E+02 8.99E+01 6.50E+01 PASS 9.65E+01 3.18E+00 1.03E+02 8.99E+01 6.50E+01 PASS 9.64E+01 3.12E+00 1.03E+02 9.00E+01 6.50E+01 PASS 9.65E+01 3.09E+00 1.03E+02 9.01E+01 6.50E+01 PASS 9.63E+01 2.95E+00 1.02E+02 9.02E+01 6.50E+01 PASS 9.64E+01 2.73E+00 1.02E+02 9.08E+01 6.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 56 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.00E+02 Power Supply Rejection Ratio #4 (dB) 9.50E+01 9.00E+01 8.50E+01 8.00E+01 7.50E+01 7.00E+01 6.50E+01 6.00E+01 5.50E+01 5.00E+01 0 50 100 150 Total Dose (krad(Si)) Figure 5.26. Plot of Power Supply Rejection Ratio #4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 57 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.26. Raw data for Power Supply Rejection Ratio #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Power Supply Rejection Ratio #4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.38E+01 9.72E+01 9.83E+01 9.69E+01 9.24E+01 9.82E+01 9.89E+01 9.37E+01 9.56E+01 9.72E+01 1.02E+02 9.77E+01 10 9.38E+01 9.72E+01 9.81E+01 9.68E+01 9.24E+01 9.84E+01 9.88E+01 9.39E+01 9.56E+01 9.69E+01 1.02E+02 9.78E+01 20 9.39E+01 9.73E+01 9.81E+01 9.70E+01 9.24E+01 9.85E+01 9.89E+01 9.39E+01 9.56E+01 9.69E+01 1.02E+02 9.78E+01 30 9.41E+01 9.73E+01 9.80E+01 9.69E+01 9.24E+01 9.86E+01 9.91E+01 9.39E+01 9.57E+01 9.69E+01 1.02E+02 9.78E+01 40 9.42E+01 9.74E+01 9.82E+01 9.71E+01 9.24E+01 9.85E+01 9.92E+01 9.39E+01 9.57E+01 9.70E+01 1.02E+02 9.77E+01 50 9.43E+01 9.74E+01 9.81E+01 9.71E+01 9.23E+01 9.87E+01 9.92E+01 9.39E+01 9.57E+01 9.69E+01 1.02E+02 9.77E+01 60 9.45E+01 9.76E+01 9.81E+01 9.71E+01 9.24E+01 9.87E+01 9.94E+01 9.40E+01 9.57E+01 9.70E+01 1.02E+02 9.76E+01 70 9.46E+01 9.76E+01 9.82E+01 9.72E+01 9.23E+01 9.84E+01 9.94E+01 9.40E+01 9.55E+01 9.72E+01 1.02E+02 9.77E+01 75 9.47E+01 9.76E+01 9.80E+01 9.73E+01 9.24E+01 9.83E+01 9.93E+01 9.39E+01 9.56E+01 9.69E+01 1.02E+02 9.77E+01 100 9.48E+01 9.76E+01 9.80E+01 9.73E+01 9.22E+01 9.83E+01 9.93E+01 9.40E+01 9.54E+01 9.70E+01 1.02E+02 9.77E+01 200 9.61E+01 9.77E+01 9.87E+01 9.77E+01 9.26E+01 9.78E+01 9.93E+01 9.41E+01 9.56E+01 9.73E+01 1.02E+02 9.78E+01 9.62E+01 2.24E+00 1.01E+02 9.16E+01 7.80E+01 PASS 9.62E+01 2.20E+00 1.01E+02 9.16E+01 7.70E+01 PASS 9.62E+01 2.22E+00 1.01E+02 9.17E+01 7.50E+01 PASS 9.63E+01 2.22E+00 1.01E+02 9.17E+01 7.50E+01 PASS 9.64E+01 2.23E+00 1.01E+02 9.17E+01 7.50E+01 PASS 9.64E+01 2.26E+00 1.01E+02 9.17E+01 6.50E+01 PASS 9.64E+01 2.24E+00 1.01E+02 9.18E+01 6.50E+01 PASS 9.64E+01 2.24E+00 1.01E+02 9.18E+01 6.50E+01 PASS 9.64E+01 2.19E+00 1.01E+02 9.19E+01 6.50E+01 PASS 9.64E+01 2.23E+00 1.01E+02 9.18E+01 6.50E+01 PASS 9.67E+01 2.10E+00 1.01E+02 9.24E+01 6.50E+01 PASS An ISO 9001:2008 and DSCC Certified Company 58 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.27. Plot of Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 59 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.27. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.10E+00 3.00E+00 2.90E+00 3.10E+00 3.10E+00 3.10E+00 3.10E+00 3.00E+00 3.00E+00 3.10E+00 3.20E+00 2.90E+00 10 3.10E+00 3.00E+00 2.90E+00 3.00E+00 3.10E+00 3.00E+00 3.10E+00 3.00E+00 3.00E+00 3.10E+00 3.20E+00 2.90E+00 20 3.00E+00 2.90E+00 2.90E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 2.90E+00 2.90E+00 3.00E+00 3.10E+00 2.90E+00 30 3.00E+00 2.90E+00 2.80E+00 2.90E+00 3.00E+00 2.90E+00 3.00E+00 2.90E+00 2.90E+00 3.00E+00 3.20E+00 2.90E+00 40 3.00E+00 2.80E+00 2.80E+00 2.90E+00 2.90E+00 2.90E+00 2.90E+00 2.90E+00 2.80E+00 2.90E+00 3.20E+00 2.90E+00 50 2.90E+00 2.80E+00 2.70E+00 2.80E+00 2.90E+00 2.80E+00 2.90E+00 2.80E+00 2.80E+00 2.90E+00 3.20E+00 2.90E+00 60 2.90E+00 2.70E+00 2.70E+00 2.80E+00 2.80E+00 2.80E+00 2.80E+00 2.80E+00 2.80E+00 2.80E+00 3.20E+00 2.90E+00 70 2.80E+00 2.70E+00 2.70E+00 2.70E+00 2.80E+00 2.80E+00 2.80E+00 2.70E+00 2.70E+00 2.80E+00 3.20E+00 2.90E+00 75 2.80E+00 2.70E+00 2.70E+00 2.70E+00 2.80E+00 2.70E+00 2.80E+00 2.70E+00 2.70E+00 2.80E+00 3.20E+00 2.90E+00 100 2.70E+00 2.60E+00 2.60E+00 2.60E+00 2.70E+00 2.60E+00 2.70E+00 2.60E+00 2.60E+00 2.70E+00 3.20E+00 2.90E+00 200 2.40E+00 2.20E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 3.20E+00 2.90E+00 3.05E+00 7.07E-02 3.20E+00 2.90E+00 1.50E+00 PASS 3.03E+00 6.75E-02 3.17E+00 2.89E+00 1.40E+00 PASS 2.96E+00 5.16E-02 3.07E+00 2.85E+00 1.30E+00 PASS 2.93E+00 6.75E-02 3.07E+00 2.79E+00 1.30E+00 PASS 2.88E+00 6.32E-02 3.01E+00 2.75E+00 1.30E+00 PASS 2.83E+00 6.75E-02 2.97E+00 2.69E+00 1.00E+00 PASS 2.79E+00 5.68E-02 2.91E+00 2.67E+00 1.00E+00 PASS 2.75E+00 5.27E-02 2.86E+00 2.64E+00 1.00E+00 PASS 2.74E+00 5.16E-02 2.85E+00 2.63E+00 1.00E+00 PASS 2.64E+00 5.16E-02 2.75E+00 2.53E+00 8.00E-01 PASS 2.28E+00 6.32E-02 2.41E+00 2.15E+00 6.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 60 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.28. Plot of Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 61 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.28. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.10E+00 2.90E+00 3.00E+00 3.20E+00 3.20E+00 3.00E+00 2.90E+00 2.90E+00 3.00E+00 2.90E+00 3.10E+00 3.10E+00 10 3.10E+00 2.90E+00 3.00E+00 3.10E+00 3.20E+00 2.90E+00 2.90E+00 2.80E+00 2.90E+00 2.90E+00 3.10E+00 3.10E+00 20 3.00E+00 2.90E+00 2.90E+00 3.10E+00 3.10E+00 2.90E+00 2.80E+00 2.80E+00 2.90E+00 2.90E+00 3.10E+00 3.10E+00 30 3.00E+00 2.80E+00 2.90E+00 3.00E+00 3.10E+00 2.90E+00 2.80E+00 2.80E+00 2.80E+00 2.80E+00 3.10E+00 3.10E+00 40 2.90E+00 2.80E+00 2.80E+00 3.00E+00 3.00E+00 2.80E+00 2.80E+00 2.70E+00 2.80E+00 2.80E+00 3.10E+00 3.10E+00 50 2.90E+00 2.70E+00 2.80E+00 2.90E+00 3.00E+00 2.80E+00 2.70E+00 2.70E+00 2.80E+00 2.70E+00 3.10E+00 3.10E+00 60 2.90E+00 2.70E+00 2.80E+00 2.90E+00 2.90E+00 2.80E+00 2.70E+00 2.60E+00 2.70E+00 2.70E+00 3.10E+00 3.10E+00 70 2.80E+00 2.70E+00 2.70E+00 2.80E+00 2.90E+00 2.70E+00 2.70E+00 2.60E+00 2.70E+00 2.70E+00 3.10E+00 3.10E+00 75 2.80E+00 2.60E+00 2.70E+00 2.80E+00 2.90E+00 2.70E+00 2.60E+00 2.60E+00 2.70E+00 2.60E+00 3.10E+00 3.10E+00 100 2.70E+00 2.50E+00 2.60E+00 2.70E+00 2.70E+00 2.60E+00 2.50E+00 2.50E+00 2.60E+00 2.50E+00 3.10E+00 3.10E+00 200 2.40E+00 2.20E+00 2.30E+00 2.30E+00 2.40E+00 2.30E+00 2.20E+00 2.20E+00 2.30E+00 2.20E+00 3.10E+00 3.10E+00 3.01E+00 1.20E-01 3.26E+00 2.76E+00 1.50E+00 PASS 2.97E+00 1.25E-01 3.23E+00 2.71E+00 1.40E+00 PASS 2.93E+00 1.06E-01 3.15E+00 2.71E+00 1.30E+00 PASS 2.89E+00 1.10E-01 3.12E+00 2.66E+00 1.30E+00 PASS 2.84E+00 9.66E-02 3.04E+00 2.64E+00 1.30E+00 PASS 2.80E+00 1.05E-01 3.02E+00 2.58E+00 1.00E+00 PASS 2.77E+00 1.06E-01 2.99E+00 2.55E+00 1.00E+00 PASS 2.73E+00 8.23E-02 2.90E+00 2.56E+00 1.00E+00 PASS 2.70E+00 1.05E-01 2.92E+00 2.48E+00 1.00E+00 PASS 2.59E+00 8.76E-02 2.77E+00 2.41E+00 8.00E-01 PASS 2.28E+00 7.89E-02 2.44E+00 2.12E+00 6.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 62 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.29. Plot of Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 63 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.29. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.10E+00 2.90E+00 3.00E+00 3.30E+00 3.20E+00 3.10E+00 3.00E+00 2.80E+00 3.00E+00 3.00E+00 3.10E+00 3.10E+00 10 3.10E+00 2.90E+00 3.00E+00 3.20E+00 3.10E+00 3.00E+00 3.00E+00 2.80E+00 3.00E+00 3.00E+00 3.10E+00 3.10E+00 20 3.10E+00 2.90E+00 2.90E+00 3.20E+00 3.10E+00 3.00E+00 2.90E+00 2.70E+00 2.90E+00 2.90E+00 3.10E+00 3.10E+00 30 3.00E+00 2.80E+00 2.90E+00 3.10E+00 3.00E+00 2.90E+00 2.90E+00 2.70E+00 2.90E+00 2.90E+00 3.10E+00 3.10E+00 40 3.00E+00 2.80E+00 2.80E+00 3.00E+00 3.00E+00 2.90E+00 2.80E+00 2.70E+00 2.90E+00 2.80E+00 3.10E+00 3.10E+00 50 2.90E+00 2.70E+00 2.80E+00 3.00E+00 3.00E+00 2.80E+00 2.80E+00 2.70E+00 2.80E+00 2.80E+00 3.10E+00 3.10E+00 60 2.90E+00 2.70E+00 2.80E+00 2.90E+00 2.90E+00 2.80E+00 2.80E+00 2.60E+00 2.80E+00 2.70E+00 3.10E+00 3.10E+00 70 2.90E+00 2.70E+00 2.70E+00 2.90E+00 2.90E+00 2.80E+00 2.70E+00 2.60E+00 2.80E+00 2.70E+00 3.10E+00 3.10E+00 75 2.80E+00 2.60E+00 2.70E+00 2.90E+00 2.80E+00 2.70E+00 2.70E+00 2.60E+00 2.70E+00 2.70E+00 3.10E+00 3.10E+00 100 2.70E+00 2.50E+00 2.60E+00 2.70E+00 2.70E+00 2.60E+00 2.60E+00 2.50E+00 2.60E+00 2.60E+00 3.10E+00 3.10E+00 200 2.40E+00 2.20E+00 2.30E+00 2.30E+00 2.40E+00 2.30E+00 2.30E+00 2.20E+00 2.30E+00 2.20E+00 3.10E+00 3.10E+00 3.04E+00 1.43E-01 3.34E+00 2.74E+00 1.50E+00 PASS 3.01E+00 1.10E-01 3.24E+00 2.78E+00 1.40E+00 PASS 2.96E+00 1.43E-01 3.26E+00 2.66E+00 1.30E+00 PASS 2.91E+00 1.10E-01 3.14E+00 2.68E+00 1.30E+00 PASS 2.87E+00 1.06E-01 3.09E+00 2.65E+00 1.30E+00 PASS 2.83E+00 1.06E-01 3.05E+00 2.61E+00 1.00E+00 PASS 2.79E+00 9.94E-02 3.00E+00 2.58E+00 1.00E+00 PASS 2.77E+00 1.06E-01 2.99E+00 2.55E+00 1.00E+00 PASS 2.72E+00 9.19E-02 2.91E+00 2.53E+00 1.00E+00 PASS 2.61E+00 7.38E-02 2.76E+00 2.46E+00 8.00E-01 PASS 2.29E+00 7.38E-02 2.44E+00 2.14E+00 6.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 64 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 3.50E+00 3.00E+00 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.30. Plot of Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 65 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.30. Raw data for Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.00E+00 3.10E+00 3.00E+00 10 3.00E+00 2.90E+00 3.00E+00 2.90E+00 2.90E+00 3.00E+00 3.00E+00 3.00E+00 2.90E+00 3.00E+00 3.10E+00 3.00E+00 20 2.90E+00 2.90E+00 3.00E+00 2.90E+00 2.90E+00 3.00E+00 3.00E+00 2.90E+00 2.90E+00 3.00E+00 3.10E+00 3.00E+00 30 2.90E+00 2.90E+00 2.90E+00 2.80E+00 2.90E+00 2.90E+00 2.90E+00 2.90E+00 2.80E+00 2.90E+00 3.10E+00 3.00E+00 40 2.90E+00 2.80E+00 2.90E+00 2.80E+00 2.80E+00 2.90E+00 2.90E+00 2.80E+00 2.80E+00 2.90E+00 3.10E+00 3.00E+00 50 2.80E+00 2.80E+00 2.80E+00 2.70E+00 2.80E+00 2.80E+00 2.90E+00 2.80E+00 2.70E+00 2.80E+00 3.10E+00 3.00E+00 60 2.80E+00 2.70E+00 2.80E+00 2.70E+00 2.70E+00 2.80E+00 2.80E+00 2.70E+00 2.70E+00 2.80E+00 3.10E+00 3.00E+00 70 2.70E+00 2.70E+00 2.80E+00 2.70E+00 2.70E+00 2.80E+00 2.80E+00 2.70E+00 2.70E+00 2.70E+00 3.10E+00 3.00E+00 75 2.70E+00 2.70E+00 2.80E+00 2.60E+00 2.70E+00 2.70E+00 2.80E+00 2.70E+00 2.70E+00 2.70E+00 3.10E+00 3.00E+00 100 2.60E+00 2.60E+00 2.70E+00 2.50E+00 2.60E+00 2.60E+00 2.70E+00 2.60E+00 2.60E+00 2.60E+00 3.10E+00 3.00E+00 200 2.30E+00 2.30E+00 2.30E+00 2.20E+00 2.30E+00 2.30E+00 2.40E+00 2.30E+00 2.20E+00 2.30E+00 3.10E+00 3.00E+00 3.00E+00 0.00E+00 3.00E+00 3.00E+00 1.50E+00 PASS 2.96E+00 5.16E-02 3.07E+00 2.85E+00 1.40E+00 PASS 2.94E+00 5.16E-02 3.05E+00 2.83E+00 1.30E+00 PASS 2.88E+00 4.22E-02 2.97E+00 2.79E+00 1.30E+00 PASS 2.85E+00 5.27E-02 2.96E+00 2.74E+00 1.30E+00 PASS 2.79E+00 5.68E-02 2.91E+00 2.67E+00 1.00E+00 PASS 2.75E+00 5.27E-02 2.86E+00 2.64E+00 1.00E+00 PASS 2.73E+00 4.83E-02 2.83E+00 2.63E+00 1.00E+00 PASS 2.71E+00 5.68E-02 2.83E+00 2.59E+00 1.00E+00 PASS 2.61E+00 5.68E-02 2.73E+00 2.49E+00 8.00E-01 PASS 2.29E+00 5.68E-02 2.41E+00 2.17E+00 6.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 66 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.31. Plot of Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 67 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.31. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.30E+00 2.30E+00 2.20E+00 2.30E+00 2.40E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 2.40E+00 2.20E+00 10 2.30E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 2.20E+00 2.30E+00 2.20E+00 2.20E+00 2.30E+00 2.40E+00 2.20E+00 20 2.30E+00 2.20E+00 2.10E+00 2.20E+00 2.30E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.40E+00 2.20E+00 30 2.20E+00 2.10E+00 2.10E+00 2.20E+00 2.30E+00 2.20E+00 2.20E+00 2.10E+00 2.10E+00 2.20E+00 2.40E+00 2.20E+00 40 2.20E+00 2.10E+00 2.10E+00 2.10E+00 2.20E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.20E+00 2.40E+00 2.20E+00 50 2.20E+00 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.40E+00 2.20E+00 60 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.20E+00 2.10E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.40E+00 2.20E+00 70 2.10E+00 2.00E+00 2.00E+00 2.00E+00 2.10E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.40E+00 2.20E+00 75 2.10E+00 2.00E+00 2.00E+00 2.00E+00 2.10E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.40E+00 2.20E+00 100 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.40E+00 2.20E+00 200 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 2.40E+00 2.20E+00 2.30E+00 4.71E-02 2.40E+00 2.20E+00 1.00E+00 PASS 2.25E+00 5.27E-02 2.36E+00 2.14E+00 9.00E-01 PASS 2.21E+00 5.68E-02 2.33E+00 2.09E+00 8.00E-01 PASS 2.17E+00 6.75E-02 2.31E+00 2.03E+00 8.00E-01 PASS 2.13E+00 4.83E-02 2.23E+00 2.03E+00 8.00E-01 PASS 2.11E+00 5.68E-02 2.23E+00 1.99E+00 6.00E-01 PASS 2.07E+00 6.75E-02 2.21E+00 1.93E+00 6.00E-01 PASS 2.02E+00 4.22E-02 2.11E+00 1.93E+00 6.00E-01 PASS 2.02E+00 4.22E-02 2.11E+00 1.93E+00 6.00E-01 PASS 1.92E+00 4.22E-02 2.01E+00 1.83E+00 5.00E-01 PASS 1.62E+00 4.22E-02 1.71E+00 1.53E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 68 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.32. Plot of Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 69 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.32. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.30E+00 2.20E+00 2.30E+00 2.40E+00 2.40E+00 2.30E+00 2.20E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 2.30E+00 10 2.30E+00 2.10E+00 2.20E+00 2.40E+00 2.40E+00 2.20E+00 2.20E+00 2.10E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 20 2.20E+00 2.10E+00 2.20E+00 2.40E+00 2.30E+00 2.20E+00 2.10E+00 2.10E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 30 2.20E+00 2.10E+00 2.20E+00 2.30E+00 2.30E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.20E+00 2.30E+00 2.30E+00 40 2.10E+00 2.10E+00 2.10E+00 2.30E+00 2.30E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.30E+00 2.30E+00 50 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.20E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.30E+00 2.30E+00 60 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.20E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.30E+00 2.30E+00 70 2.00E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 2.30E+00 2.30E+00 75 2.00E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 2.30E+00 2.30E+00 100 1.90E+00 1.80E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.90E+00 2.30E+00 2.30E+00 200 1.60E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.50E+00 1.60E+00 1.60E+00 2.30E+00 2.30E+00 2.28E+00 7.89E-02 2.44E+00 2.12E+00 1.00E+00 PASS 2.23E+00 1.06E-01 2.45E+00 2.01E+00 9.00E-01 PASS 2.20E+00 9.43E-02 2.39E+00 2.01E+00 8.00E-01 PASS 2.17E+00 8.23E-02 2.34E+00 2.00E+00 8.00E-01 PASS 2.12E+00 1.03E-01 2.33E+00 1.91E+00 8.00E-01 PASS 2.09E+00 7.38E-02 2.24E+00 1.94E+00 6.00E-01 PASS 2.06E+00 8.43E-02 2.23E+00 1.89E+00 6.00E-01 PASS 1.99E+00 7.38E-02 2.14E+00 1.84E+00 6.00E-01 PASS 1.99E+00 7.38E-02 2.14E+00 1.84E+00 6.00E-01 PASS 1.90E+00 6.67E-02 2.04E+00 1.76E+00 5.00E-01 PASS 1.61E+00 5.68E-02 1.73E+00 1.49E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 70 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.33. Plot of Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 71 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.33. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.30E+00 2.20E+00 2.30E+00 2.50E+00 2.40E+00 2.30E+00 2.30E+00 2.20E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 10 2.30E+00 2.20E+00 2.20E+00 2.50E+00 2.40E+00 2.30E+00 2.20E+00 2.10E+00 2.20E+00 2.30E+00 2.30E+00 2.30E+00 20 2.30E+00 2.10E+00 2.20E+00 2.40E+00 2.30E+00 2.20E+00 2.20E+00 2.10E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 30 2.20E+00 2.10E+00 2.20E+00 2.40E+00 2.30E+00 2.20E+00 2.10E+00 2.00E+00 2.20E+00 2.20E+00 2.30E+00 2.30E+00 40 2.20E+00 2.10E+00 2.10E+00 2.30E+00 2.30E+00 2.20E+00 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.30E+00 2.30E+00 50 2.10E+00 2.00E+00 2.10E+00 2.30E+00 2.20E+00 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.10E+00 2.30E+00 2.30E+00 60 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.20E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.30E+00 2.30E+00 70 2.10E+00 2.00E+00 2.00E+00 2.20E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 2.10E+00 2.00E+00 2.30E+00 2.30E+00 75 2.10E+00 1.90E+00 2.00E+00 2.20E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 2.00E+00 2.00E+00 2.30E+00 2.30E+00 100 2.00E+00 1.90E+00 1.90E+00 2.10E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.90E+00 2.30E+00 2.30E+00 200 1.70E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 2.30E+00 2.30E+00 2.31E+00 8.76E-02 2.49E+00 2.13E+00 1.00E+00 PASS 2.27E+00 1.16E-01 2.51E+00 2.03E+00 9.00E-01 PASS 2.22E+00 9.19E-02 2.41E+00 2.03E+00 8.00E-01 PASS 2.19E+00 1.10E-01 2.42E+00 1.96E+00 8.00E-01 PASS 2.16E+00 9.66E-02 2.36E+00 1.96E+00 8.00E-01 PASS 2.11E+00 8.76E-02 2.29E+00 1.93E+00 6.00E-01 PASS 2.09E+00 7.38E-02 2.24E+00 1.94E+00 6.00E-01 PASS 2.04E+00 8.43E-02 2.21E+00 1.87E+00 6.00E-01 PASS 2.02E+00 9.19E-02 2.21E+00 1.83E+00 6.00E-01 PASS 1.93E+00 8.23E-02 2.10E+00 1.76E+00 5.00E-01 PASS 1.63E+00 4.83E-02 1.73E+00 1.53E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 72 RLAT Report 10-326 100808 R1.0 Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.34. Plot of Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 73 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.34. Raw data for Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.30E+00 2.20E+00 2.30E+00 2.20E+00 2.30E+00 2.30E+00 2.30E+00 2.30E+00 2.20E+00 2.30E+00 2.30E+00 2.20E+00 10 2.20E+00 2.20E+00 2.30E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.30E+00 2.20E+00 20 2.20E+00 2.20E+00 2.20E+00 2.10E+00 2.20E+00 2.20E+00 2.20E+00 2.20E+00 2.10E+00 2.20E+00 2.30E+00 2.20E+00 30 2.20E+00 2.10E+00 2.20E+00 2.10E+00 2.20E+00 2.20E+00 2.20E+00 2.10E+00 2.10E+00 2.20E+00 2.30E+00 2.20E+00 40 2.10E+00 2.10E+00 2.20E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.30E+00 2.20E+00 50 2.10E+00 2.10E+00 2.20E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.30E+00 2.20E+00 60 2.10E+00 2.00E+00 2.10E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.00E+00 2.00E+00 2.00E+00 2.30E+00 2.20E+00 70 2.00E+00 2.00E+00 2.10E+00 1.90E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.30E+00 2.20E+00 75 2.00E+00 2.00E+00 2.10E+00 1.90E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.30E+00 2.20E+00 100 1.90E+00 1.90E+00 2.00E+00 1.80E+00 1.90E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.30E+00 2.20E+00 200 1.60E+00 1.60E+00 1.70E+00 1.50E+00 1.60E+00 1.60E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 2.30E+00 2.20E+00 2.27E+00 4.83E-02 2.37E+00 2.17E+00 1.00E+00 PASS 2.21E+00 3.16E-02 2.28E+00 2.14E+00 9.00E-01 PASS 2.18E+00 4.22E-02 2.27E+00 2.09E+00 8.00E-01 PASS 2.16E+00 5.16E-02 2.27E+00 2.05E+00 8.00E-01 PASS 2.11E+00 3.16E-02 2.18E+00 2.04E+00 8.00E-01 PASS 2.09E+00 5.68E-02 2.21E+00 1.97E+00 6.00E-01 PASS 2.05E+00 5.27E-02 2.16E+00 1.94E+00 6.00E-01 PASS 2.00E+00 4.71E-02 2.10E+00 1.90E+00 6.00E-01 PASS 2.00E+00 4.71E-02 2.10E+00 1.90E+00 6.00E-01 PASS 1.91E+00 5.68E-02 2.03E+00 1.79E+00 5.00E-01 PASS 1.61E+00 5.68E-02 1.73E+00 1.49E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 74 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 1:2 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.35. Plot of Channel Separation @+/-5V 1:2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 75 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.35. Raw data for Channel Separation @+/-5V 1:2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 1:2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.32E+02 1.22E+02 1.13E+02 1.29E+02 1.24E+02 1.30E+02 1.32E+02 1.16E+02 1.08E+02 1.12E+02 1.16E+02 1.14E+02 10 1.22E+02 1.24E+02 1.20E+02 1.16E+02 1.16E+02 1.13E+02 1.15E+02 1.10E+02 1.29E+02 1.28E+02 1.20E+02 1.23E+02 20 1.12E+02 1.14E+02 1.15E+02 1.20E+02 1.12E+02 1.14E+02 1.19E+02 1.13E+02 1.34E+02 1.14E+02 1.27E+02 1.13E+02 30 1.24E+02 1.13E+02 1.13E+02 1.06E+02 1.21E+02 1.22E+02 1.21E+02 1.24E+02 1.06E+02 1.12E+02 1.09E+02 1.14E+02 40 1.25E+02 1.16E+02 1.06E+02 1.31E+02 1.13E+02 1.13E+02 1.27E+02 1.32E+02 1.13E+02 1.31E+02 1.19E+02 1.05E+02 50 1.21E+02 1.15E+02 1.15E+02 1.14E+02 1.18E+02 1.13E+02 1.14E+02 1.36E+02 1.19E+02 1.13E+02 1.31E+02 1.34E+02 60 1.11E+02 1.13E+02 1.09E+02 1.18E+02 1.39E+02 1.15E+02 1.06E+02 1.12E+02 1.11E+02 1.25E+02 1.15E+02 1.10E+02 70 1.03E+02 1.13E+02 1.10E+02 1.10E+02 1.21E+02 1.15E+02 1.14E+02 1.35E+02 1.07E+02 1.09E+02 1.18E+02 1.10E+02 75 1.09E+02 1.21E+02 1.13E+02 1.11E+02 1.14E+02 1.12E+02 1.17E+02 1.27E+02 1.32E+02 1.11E+02 1.11E+02 1.20E+02 100 1.22E+02 1.16E+02 1.22E+02 1.30E+02 1.40E+02 1.26E+02 1.16E+02 1.23E+02 1.13E+02 1.16E+02 1.14E+02 1.27E+02 200 1.20E+02 1.15E+02 1.20E+02 1.26E+02 1.41E+02 1.38E+02 1.11E+02 1.10E+02 1.23E+02 1.19E+02 1.13E+02 1.11E+02 1.22E+02 8.98E+00 1.40E+02 1.03E+02 8.20E+01 PASS 1.19E+02 6.61E+00 1.33E+02 1.06E+02 8.20E+01 PASS 1.17E+02 6.71E+00 1.31E+02 1.03E+02 8.20E+01 PASS 1.16E+02 7.09E+00 1.31E+02 1.02E+02 8.20E+01 PASS 1.21E+02 9.63E+00 1.41E+02 1.01E+02 8.20E+01 PASS 1.18E+02 6.80E+00 1.32E+02 1.04E+02 8.20E+01 PASS 1.16E+02 9.63E+00 1.36E+02 9.59E+01 8.20E+01 PASS 1.14E+02 8.72E+00 1.32E+02 9.57E+01 8.20E+01 PASS 1.17E+02 7.66E+00 1.33E+02 1.01E+02 8.20E+01 PASS 1.22E+02 7.95E+00 1.39E+02 1.06E+02 8.20E+01 PASS 1.22E+02 1.04E+01 1.44E+02 1.01E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 76 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 1:3 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.36. Plot of Channel Separation @+/-5V 1:3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 77 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.36. Raw data for Channel Separation @+/-5V 1:3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 1:3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.18E+02 1.29E+02 1.18E+02 1.09E+02 1.15E+02 1.31E+02 1.08E+02 1.13E+02 1.14E+02 1.12E+02 1.18E+02 1.11E+02 10 1.07E+02 1.23E+02 1.11E+02 1.05E+02 1.09E+02 1.12E+02 1.13E+02 1.14E+02 1.17E+02 1.09E+02 1.28E+02 1.27E+02 20 1.11E+02 1.35E+02 1.23E+02 1.07E+02 1.14E+02 1.20E+02 1.29E+02 1.17E+02 1.36E+02 1.07E+02 1.13E+02 1.32E+02 30 1.19E+02 1.14E+02 1.06E+02 1.14E+02 1.18E+02 1.19E+02 1.17E+02 1.13E+02 1.09E+02 1.14E+02 1.15E+02 1.13E+02 40 1.27E+02 1.39E+02 1.37E+02 1.06E+02 1.22E+02 1.24E+02 1.26E+02 1.30E+02 1.09E+02 1.22E+02 1.15E+02 1.18E+02 50 1.14E+02 1.10E+02 1.11E+02 1.15E+02 1.04E+02 1.35E+02 1.35E+02 1.28E+02 1.20E+02 1.16E+02 1.11E+02 1.14E+02 60 1.37E+02 1.15E+02 1.36E+02 1.22E+02 1.23E+02 1.11E+02 1.20E+02 1.19E+02 1.10E+02 1.15E+02 1.16E+02 1.20E+02 70 1.17E+02 1.30E+02 1.31E+02 1.38E+02 1.16E+02 1.20E+02 1.08E+02 1.33E+02 1.18E+02 1.08E+02 1.17E+02 1.22E+02 75 1.05E+02 1.20E+02 1.06E+02 1.41E+02 1.12E+02 1.15E+02 1.09E+02 1.23E+02 1.19E+02 1.20E+02 1.44E+02 1.77E+02 100 1.11E+02 1.07E+02 1.11E+02 1.08E+02 1.08E+02 1.10E+02 1.18E+02 1.14E+02 1.28E+02 1.08E+02 1.13E+02 1.22E+02 200 1.18E+02 1.14E+02 1.11E+02 1.18E+02 1.23E+02 1.16E+02 1.21E+02 1.15E+02 1.15E+02 1.31E+02 1.16E+02 1.29E+02 1.17E+02 7.74E+00 1.33E+02 1.01E+02 8.20E+01 PASS 1.12E+02 5.38E+00 1.23E+02 1.01E+02 8.20E+01 PASS 1.20E+02 1.08E+01 1.42E+02 9.76E+01 8.20E+01 PASS 1.14E+02 4.19E+00 1.23E+02 1.06E+02 8.20E+01 PASS 1.24E+02 1.07E+01 1.46E+02 1.02E+02 8.20E+01 PASS 1.19E+02 1.06E+01 1.41E+02 9.69E+01 8.20E+01 PASS 1.21E+02 9.26E+00 1.40E+02 1.02E+02 8.20E+01 PASS 1.22E+02 1.06E+01 1.44E+02 1.00E+02 8.20E+01 PASS 1.17E+02 1.05E+01 1.39E+02 9.53E+01 8.20E+01 PASS 1.12E+02 6.41E+00 1.25E+02 9.90E+01 8.20E+01 PASS 1.18E+02 5.65E+00 1.30E+02 1.07E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 78 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 1:4 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.37. Plot of Channel Separation @+/-5V 1:4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 79 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.37. Raw data for Channel Separation @+/-5V 1:4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 1:4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.14E+02 1.01E+02 1.03E+02 1.07E+02 1.06E+02 1.02E+02 1.04E+02 1.14E+02 1.07E+02 1.10E+02 1.03E+02 1.02E+02 10 1.12E+02 1.07E+02 1.02E+02 1.06E+02 1.09E+02 1.07E+02 1.04E+02 1.09E+02 1.10E+02 1.07E+02 1.03E+02 1.05E+02 20 1.04E+02 1.07E+02 1.07E+02 1.12E+02 1.03E+02 1.04E+02 1.16E+02 1.13E+02 1.02E+02 1.06E+02 1.05E+02 1.01E+02 30 1.03E+02 1.06E+02 1.09E+02 1.07E+02 1.03E+02 1.01E+02 1.08E+02 1.11E+02 1.12E+02 1.04E+02 1.11E+02 1.06E+02 40 1.08E+02 1.11E+02 1.06E+02 1.16E+02 1.04E+02 1.01E+02 1.04E+02 1.10E+02 1.06E+02 1.09E+02 1.08E+02 1.01E+02 50 1.08E+02 1.00E+02 1.01E+02 1.28E+02 1.05E+02 1.00E+02 1.03E+02 1.25E+02 1.12E+02 1.03E+02 1.07E+02 1.04E+02 60 1.57E+02 1.07E+02 1.06E+02 1.04E+02 1.06E+02 1.16E+02 1.10E+02 1.06E+02 1.14E+02 1.10E+02 1.12E+02 1.06E+02 70 1.05E+02 1.06E+02 1.01E+02 1.07E+02 1.08E+02 1.10E+02 1.18E+02 1.03E+02 1.14E+02 1.09E+02 1.03E+02 1.07E+02 75 1.14E+02 1.11E+02 1.09E+02 1.05E+02 1.02E+02 1.07E+02 1.05E+02 1.05E+02 1.10E+02 1.11E+02 1.05E+02 1.12E+02 100 1.07E+02 1.03E+02 1.06E+02 1.22E+02 1.08E+02 1.05E+02 1.03E+02 1.11E+02 1.02E+02 1.07E+02 1.03E+02 1.02E+02 200 1.15E+02 1.06E+02 1.00E+02 1.09E+02 1.05E+02 1.03E+02 1.35E+02 1.14E+02 1.04E+02 1.24E+02 1.02E+02 1.02E+02 1.07E+02 4.60E+00 1.16E+02 9.72E+01 8.20E+01 PASS 1.07E+02 2.88E+00 1.13E+02 1.01E+02 8.20E+01 PASS 1.08E+02 4.79E+00 1.17E+02 9.77E+01 8.20E+01 PASS 1.06E+02 3.52E+00 1.14E+02 9.91E+01 8.20E+01 PASS 1.07E+02 4.35E+00 1.16E+02 9.85E+01 8.20E+01 PASS 1.08E+02 1.01E+01 1.29E+02 8.75E+01 8.20E+01 PASS 1.14E+02 1.59E+01 1.46E+02 8.06E+01 8.20E+01 PASS 1.08E+02 5.08E+00 1.19E+02 9.77E+01 8.20E+01 PASS 1.08E+02 3.58E+00 1.15E+02 1.00E+02 8.20E+01 PASS 1.07E+02 5.78E+00 1.19E+02 9.54E+01 8.20E+01 PASS 1.12E+02 1.08E+01 1.34E+02 8.91E+01 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 80 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 2:1 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.38. Plot of Channel Separation @+/-5V 2:1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 81 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.38. Raw data for Channel Separation @+/-5V 2:1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 2:1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.27E+02 1.26E+02 1.15E+02 1.20E+02 1.25E+02 1.11E+02 1.25E+02 1.13E+02 1.22E+02 1.22E+02 1.23E+02 1.16E+02 10 1.18E+02 1.27E+02 1.19E+02 1.23E+02 1.30E+02 1.11E+02 1.06E+02 1.07E+02 1.52E+02 1.17E+02 1.07E+02 1.44E+02 20 1.07E+02 1.10E+02 1.03E+02 1.05E+02 1.13E+02 1.17E+02 1.41E+02 1.13E+02 1.19E+02 1.11E+02 1.11E+02 1.10E+02 30 1.20E+02 1.13E+02 1.16E+02 1.35E+02 1.05E+02 1.09E+02 1.12E+02 1.10E+02 1.08E+02 1.09E+02 1.14E+02 1.21E+02 40 1.17E+02 1.11E+02 1.07E+02 1.15E+02 1.19E+02 1.06E+02 1.20E+02 1.31E+02 1.18E+02 1.14E+02 1.24E+02 1.08E+02 50 1.07E+02 1.20E+02 1.20E+02 1.22E+02 1.12E+02 1.31E+02 1.07E+02 1.13E+02 1.27E+02 1.44E+02 1.08E+02 1.05E+02 60 1.19E+02 1.16E+02 1.20E+02 1.09E+02 1.25E+02 1.45E+02 1.08E+02 1.08E+02 1.30E+02 1.26E+02 1.05E+02 1.12E+02 70 1.04E+02 1.49E+02 1.34E+02 1.21E+02 1.18E+02 1.14E+02 1.49E+02 1.13E+02 1.08E+02 1.10E+02 1.14E+02 1.17E+02 75 1.17E+02 1.11E+02 1.10E+02 1.19E+02 1.19E+02 1.08E+02 1.17E+02 1.16E+02 1.54E+02 1.31E+02 1.08E+02 1.31E+02 100 1.51E+02 1.19E+02 1.13E+02 1.14E+02 1.10E+02 1.05E+02 1.25E+02 1.20E+02 1.01E+02 1.16E+02 1.11E+02 1.22E+02 200 1.10E+02 1.32E+02 1.09E+02 1.19E+02 1.11E+02 1.20E+02 1.16E+02 1.13E+02 1.22E+02 1.10E+02 1.08E+02 1.11E+02 1.21E+02 5.57E+00 1.32E+02 1.09E+02 8.20E+01 PASS 1.21E+02 1.34E+01 1.48E+02 9.32E+01 8.20E+01 PASS 1.14E+02 1.06E+01 1.36E+02 9.19E+01 8.20E+01 PASS 1.14E+02 8.41E+00 1.31E+02 9.63E+01 8.20E+01 PASS 1.16E+02 7.24E+00 1.31E+02 1.01E+02 8.20E+01 PASS 1.20E+02 1.16E+01 1.44E+02 9.62E+01 8.20E+01 PASS 1.20E+02 1.17E+01 1.45E+02 9.62E+01 8.20E+01 PASS 1.22E+02 1.65E+01 1.56E+02 8.79E+01 8.20E+01 PASS 1.20E+02 1.34E+01 1.48E+02 9.26E+01 8.20E+01 PASS 1.17E+02 1.36E+01 1.46E+02 8.92E+01 8.20E+01 PASS 1.16E+02 7.22E+00 1.31E+02 1.01E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 82 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 2:3 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.39. Plot of Channel Separation @+/-5V 2:3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 83 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.39. Raw data for Channel Separation @+/-5V 2:3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 2:3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.01E+02 1.16E+02 1.07E+02 1.07E+02 1.16E+02 1.03E+02 1.01E+02 1.05E+02 1.05E+02 1.04E+02 1.16E+02 1.07E+02 10 1.08E+02 1.03E+02 1.07E+02 1.03E+02 1.05E+02 1.06E+02 1.06E+02 1.14E+02 1.01E+02 1.02E+02 1.02E+02 1.02E+02 20 1.02E+02 1.11E+02 1.05E+02 1.04E+02 1.07E+02 1.10E+02 1.03E+02 1.04E+02 1.02E+02 1.03E+02 1.06E+02 1.07E+02 30 1.06E+02 1.33E+02 1.05E+02 1.02E+02 1.09E+02 1.05E+02 1.03E+02 1.16E+02 1.03E+02 1.04E+02 1.03E+02 1.06E+02 40 1.06E+02 1.23E+02 1.08E+02 1.04E+02 1.10E+02 1.06E+02 1.06E+02 1.17E+02 1.04E+02 1.07E+02 1.04E+02 1.01E+02 50 1.11E+02 1.07E+02 1.11E+02 1.15E+02 1.07E+02 1.05E+02 1.08E+02 1.07E+02 1.16E+02 1.06E+02 1.16E+02 1.14E+02 60 1.10E+02 1.05E+02 1.02E+02 1.04E+02 9.95E+01 1.01E+02 1.07E+02 1.05E+02 1.04E+02 1.01E+02 1.02E+02 1.05E+02 70 1.05E+02 1.06E+02 1.20E+02 1.07E+02 1.03E+02 1.08E+02 1.10E+02 1.03E+02 1.05E+02 1.04E+02 1.08E+02 1.03E+02 75 1.05E+02 1.04E+02 1.05E+02 1.12E+02 1.15E+02 1.01E+02 1.14E+02 1.08E+02 1.05E+02 1.02E+02 1.07E+02 1.29E+02 100 1.06E+02 1.10E+02 1.05E+02 1.24E+02 1.09E+02 1.09E+02 1.01E+02 1.05E+02 1.06E+02 1.02E+02 1.07E+02 9.99E+01 200 1.02E+02 1.09E+02 1.06E+02 1.05E+02 1.06E+02 1.03E+02 1.02E+02 1.08E+02 1.00E+02 1.02E+02 1.08E+02 1.07E+02 1.07E+02 5.29E+00 1.17E+02 9.56E+01 8.20E+01 PASS 1.05E+02 3.60E+00 1.13E+02 9.80E+01 8.20E+01 PASS 1.05E+02 3.02E+00 1.11E+02 9.89E+01 8.20E+01 PASS 1.08E+02 9.56E+00 1.28E+02 8.87E+01 8.20E+01 PASS 1.09E+02 6.25E+00 1.22E+02 9.65E+01 8.20E+01 PASS 1.09E+02 3.67E+00 1.17E+02 1.02E+02 8.20E+01 PASS 1.04E+02 3.13E+00 1.10E+02 9.74E+01 8.20E+01 PASS 1.07E+02 5.00E+00 1.17E+02 9.68E+01 8.20E+01 PASS 1.07E+02 5.00E+00 1.17E+02 9.66E+01 8.20E+01 PASS 1.08E+02 6.57E+00 1.21E+02 9.42E+01 8.20E+01 PASS 1.04E+02 2.78E+00 1.10E+02 9.85E+01 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 84 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 2:4 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.40. Plot of Channel Separation @+/-5V 2:4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 85 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.40. Raw data for Channel Separation @+/-5V 2:4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 2:4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.10E+02 1.14E+02 1.14E+02 1.13E+02 1.11E+02 1.13E+02 1.27E+02 1.14E+02 1.27E+02 1.04E+02 1.17E+02 1.22E+02 10 1.12E+02 1.12E+02 1.19E+02 1.12E+02 1.39E+02 1.28E+02 1.15E+02 1.40E+02 1.15E+02 1.07E+02 1.13E+02 1.18E+02 20 1.17E+02 1.25E+02 1.24E+02 1.11E+02 1.26E+02 1.18E+02 1.21E+02 1.14E+02 1.10E+02 1.17E+02 1.16E+02 1.08E+02 30 1.10E+02 1.16E+02 1.15E+02 1.08E+02 1.09E+02 1.25E+02 1.22E+02 1.27E+02 1.13E+02 1.05E+02 1.12E+02 1.30E+02 40 1.23E+02 1.39E+02 1.30E+02 1.22E+02 1.07E+02 1.18E+02 1.14E+02 1.10E+02 1.08E+02 1.11E+02 1.31E+02 1.13E+02 50 1.18E+02 1.23E+02 1.17E+02 1.17E+02 1.28E+02 1.14E+02 1.31E+02 1.13E+02 1.09E+02 1.33E+02 1.04E+02 1.25E+02 60 1.12E+02 1.25E+02 1.09E+02 1.08E+02 1.23E+02 1.18E+02 1.09E+02 1.18E+02 1.40E+02 1.18E+02 1.20E+02 1.07E+02 70 1.14E+02 1.14E+02 1.10E+02 1.27E+02 1.15E+02 1.11E+02 1.25E+02 1.08E+02 1.09E+02 1.18E+02 1.09E+02 1.27E+02 75 1.14E+02 1.13E+02 1.14E+02 1.22E+02 1.09E+02 1.36E+02 1.25E+02 1.10E+02 1.10E+02 1.11E+02 1.13E+02 1.31E+02 100 1.17E+02 1.09E+02 1.39E+02 1.23E+02 1.32E+02 1.19E+02 1.25E+02 1.14E+02 1.14E+02 1.05E+02 1.20E+02 1.12E+02 200 1.21E+02 1.10E+02 1.11E+02 1.09E+02 1.07E+02 1.27E+02 1.16E+02 1.23E+02 1.08E+02 1.14E+02 1.15E+02 1.07E+02 1.15E+02 7.30E+00 1.30E+02 9.95E+01 8.20E+01 PASS 1.20E+02 1.18E+01 1.44E+02 9.56E+01 8.20E+01 PASS 1.18E+02 5.73E+00 1.30E+02 1.07E+02 8.20E+01 PASS 1.15E+02 7.31E+00 1.30E+02 9.98E+01 8.20E+01 PASS 1.18E+02 1.03E+01 1.40E+02 9.70E+01 8.20E+01 PASS 1.20E+02 8.16E+00 1.37E+02 1.03E+02 8.20E+01 PASS 1.18E+02 9.79E+00 1.38E+02 9.77E+01 8.20E+01 PASS 1.15E+02 6.49E+00 1.28E+02 1.02E+02 8.20E+01 PASS 1.16E+02 8.60E+00 1.34E+02 9.86E+01 8.20E+01 PASS 1.20E+02 1.03E+01 1.41E+02 9.83E+01 8.20E+01 PASS 1.14E+02 6.77E+00 1.28E+02 1.00E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 86 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 3:1 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.41. Plot of Channel Separation @+/-5V 3:1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 87 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.41. Raw data for Channel Separation @+/-5V 3:1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 3:1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.08E+02 1.15E+02 1.13E+02 1.18E+02 1.17E+02 1.18E+02 1.21E+02 1.10E+02 1.12E+02 1.10E+02 1.16E+02 1.17E+02 10 1.09E+02 1.11E+02 1.31E+02 1.24E+02 1.12E+02 1.10E+02 1.09E+02 1.17E+02 1.09E+02 1.23E+02 1.22E+02 1.29E+02 20 1.17E+02 1.19E+02 1.17E+02 1.08E+02 1.10E+02 1.09E+02 1.24E+02 1.06E+02 1.32E+02 1.34E+02 1.10E+02 1.07E+02 30 1.07E+02 1.03E+02 1.13E+02 1.09E+02 1.07E+02 1.11E+02 1.16E+02 1.04E+02 1.08E+02 1.14E+02 1.16E+02 1.17E+02 40 1.26E+02 1.10E+02 1.56E+02 1.13E+02 1.14E+02 1.42E+02 1.32E+02 1.39E+02 1.05E+02 1.27E+02 1.69E+02 1.20E+02 50 1.20E+02 1.12E+02 1.07E+02 1.20E+02 1.15E+02 1.14E+02 1.05E+02 1.09E+02 1.11E+02 1.04E+02 1.15E+02 1.17E+02 60 1.43E+02 1.12E+02 1.14E+02 1.09E+02 1.23E+02 1.14E+02 1.04E+02 1.24E+02 1.14E+02 1.13E+02 1.05E+02 1.19E+02 70 1.09E+02 1.02E+02 1.20E+02 1.15E+02 1.02E+02 1.09E+02 1.08E+02 1.08E+02 1.04E+02 1.15E+02 1.10E+02 1.10E+02 75 1.09E+02 1.17E+02 1.11E+02 1.12E+02 1.27E+02 1.11E+02 1.14E+02 1.16E+02 1.16E+02 1.14E+02 1.09E+02 1.05E+02 100 1.19E+02 1.22E+02 1.16E+02 1.06E+02 1.18E+02 1.34E+02 1.16E+02 1.11E+02 1.13E+02 1.08E+02 1.16E+02 1.08E+02 200 1.27E+02 1.13E+02 1.14E+02 1.18E+02 1.22E+02 1.16E+02 1.11E+02 1.23E+02 1.19E+02 1.11E+02 1.11E+02 1.10E+02 1.14E+02 4.11E+00 1.23E+02 1.06E+02 8.20E+01 PASS 1.15E+02 7.77E+00 1.32E+02 9.94E+01 8.20E+01 PASS 1.17E+02 9.94E+00 1.38E+02 9.70E+01 8.20E+01 PASS 1.09E+02 4.39E+00 1.18E+02 1.00E+02 8.20E+01 PASS 1.26E+02 1.62E+01 1.60E+02 9.29E+01 8.20E+01 PASS 1.12E+02 5.51E+00 1.23E+02 1.00E+02 8.20E+01 PASS 1.17E+02 1.09E+01 1.39E+02 9.44E+01 8.20E+01 PASS 1.09E+02 5.99E+00 1.21E+02 9.68E+01 8.20E+01 PASS 1.15E+02 4.98E+00 1.25E+02 1.04E+02 8.20E+01 PASS 1.16E+02 7.88E+00 1.33E+02 1.00E+02 8.20E+01 PASS 1.17E+02 5.32E+00 1.28E+02 1.06E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 88 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 3:2 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.42. Plot of Channel Separation @+/-5V 3:2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 89 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.42. Raw data for Channel Separation @+/-5V 3:2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 3:2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.07E+02 1.07E+02 1.06E+02 1.07E+02 1.24E+02 1.08E+02 1.05E+02 1.08E+02 1.23E+02 9.99E+01 1.05E+02 1.07E+02 10 1.01E+02 1.15E+02 1.08E+02 1.06E+02 1.07E+02 1.04E+02 1.02E+02 1.23E+02 1.13E+02 1.07E+02 1.07E+02 1.02E+02 20 1.04E+02 1.04E+02 1.10E+02 1.05E+02 1.11E+02 1.08E+02 1.15E+02 1.09E+02 1.05E+02 1.10E+02 1.11E+02 1.08E+02 30 1.11E+02 1.04E+02 1.19E+02 1.10E+02 1.07E+02 1.03E+02 1.05E+02 1.09E+02 1.06E+02 1.12E+02 1.08E+02 1.05E+02 40 1.01E+02 1.04E+02 1.06E+02 1.02E+02 1.09E+02 1.03E+02 1.06E+02 1.03E+02 1.02E+02 1.04E+02 1.11E+02 1.06E+02 50 1.08E+02 1.12E+02 1.11E+02 1.12E+02 1.10E+02 1.07E+02 1.13E+02 1.05E+02 1.10E+02 1.06E+02 1.23E+02 1.06E+02 60 1.14E+02 1.15E+02 1.07E+02 9.83E+01 1.45E+02 1.10E+02 1.03E+02 1.16E+02 1.01E+02 1.06E+02 1.04E+02 1.05E+02 70 1.04E+02 1.14E+02 1.06E+02 1.04E+02 1.25E+02 1.02E+02 1.12E+02 1.19E+02 1.06E+02 1.08E+02 1.12E+02 1.08E+02 75 1.06E+02 1.08E+02 1.14E+02 1.09E+02 1.04E+02 1.03E+02 1.06E+02 1.05E+02 1.07E+02 1.18E+02 1.11E+02 1.28E+02 100 1.14E+02 1.13E+02 1.11E+02 1.05E+02 1.05E+02 1.10E+02 1.06E+02 1.01E+02 1.31E+02 1.08E+02 1.11E+02 1.06E+02 200 1.06E+02 1.05E+02 1.04E+02 1.08E+02 1.25E+02 1.31E+02 1.05E+02 1.04E+02 1.04E+02 1.03E+02 1.09E+02 1.14E+02 1.09E+02 7.77E+00 1.25E+02 9.34E+01 8.20E+01 PASS 1.08E+02 6.68E+00 1.22E+02 9.47E+01 8.20E+01 PASS 1.08E+02 3.59E+00 1.16E+02 1.01E+02 8.20E+01 PASS 1.09E+02 4.80E+00 1.19E+02 9.88E+01 8.20E+01 PASS 1.04E+02 2.53E+00 1.09E+02 9.88E+01 8.20E+01 PASS 1.10E+02 2.72E+00 1.15E+02 1.04E+02 8.20E+01 PASS 1.12E+02 1.34E+01 1.39E+02 8.41E+01 8.20E+01 PASS 1.10E+02 7.29E+00 1.25E+02 9.48E+01 8.20E+01 PASS 1.08E+02 4.81E+00 1.18E+02 9.80E+01 8.20E+01 PASS 1.10E+02 8.21E+00 1.27E+02 9.34E+01 8.20E+01 PASS 1.10E+02 9.85E+00 1.30E+02 8.92E+01 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 90 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 3:4 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.43. Plot of Channel Separation @+/-5V 3:4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 91 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.43. Raw data for Channel Separation @+/-5V 3:4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 3:4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.14E+02 1.13E+02 1.17E+02 1.12E+02 1.24E+02 1.16E+02 1.13E+02 1.10E+02 1.07E+02 1.16E+02 1.11E+02 1.05E+02 10 1.38E+02 1.25E+02 1.17E+02 1.34E+02 1.27E+02 1.32E+02 1.08E+02 1.02E+02 1.10E+02 1.17E+02 1.13E+02 1.19E+02 20 1.17E+02 1.08E+02 1.11E+02 1.25E+02 1.11E+02 1.24E+02 1.17E+02 1.13E+02 1.10E+02 1.09E+02 1.11E+02 1.18E+02 30 1.17E+02 1.17E+02 1.19E+02 1.18E+02 1.28E+02 1.05E+02 1.04E+02 1.17E+02 1.22E+02 1.15E+02 1.17E+02 1.14E+02 40 1.10E+02 1.11E+02 1.54E+02 1.07E+02 1.19E+02 1.10E+02 1.11E+02 1.11E+02 1.21E+02 1.18E+02 1.18E+02 1.12E+02 50 1.26E+02 1.24E+02 1.16E+02 1.32E+02 1.41E+02 1.11E+02 1.23E+02 1.09E+02 1.08E+02 1.15E+02 1.38E+02 1.22E+02 60 1.17E+02 1.11E+02 1.51E+02 1.12E+02 1.21E+02 1.10E+02 1.14E+02 1.04E+02 1.13E+02 1.25E+02 1.15E+02 1.09E+02 70 1.18E+02 1.20E+02 1.08E+02 1.25E+02 1.12E+02 1.09E+02 1.12E+02 1.17E+02 1.10E+02 1.16E+02 1.10E+02 1.27E+02 75 1.14E+02 1.22E+02 1.37E+02 1.16E+02 1.22E+02 1.10E+02 1.17E+02 1.25E+02 1.21E+02 1.16E+02 1.22E+02 1.15E+02 100 1.17E+02 1.07E+02 1.16E+02 1.34E+02 1.14E+02 1.03E+02 1.32E+02 1.24E+02 1.08E+02 1.09E+02 1.12E+02 1.08E+02 200 1.26E+02 1.25E+02 1.10E+02 1.14E+02 1.23E+02 1.08E+02 1.21E+02 1.13E+02 1.14E+02 1.23E+02 1.09E+02 1.25E+02 1.14E+02 4.51E+00 1.24E+02 1.05E+02 8.20E+01 PASS 1.21E+02 1.19E+01 1.46E+02 9.62E+01 8.20E+01 PASS 1.14E+02 6.22E+00 1.27E+02 1.01E+02 8.20E+01 PASS 1.16E+02 7.08E+00 1.31E+02 1.02E+02 8.20E+01 PASS 1.17E+02 1.38E+01 1.46E+02 8.88E+01 8.20E+01 PASS 1.21E+02 1.07E+01 1.43E+02 9.85E+01 8.20E+01 PASS 1.18E+02 1.31E+01 1.45E+02 9.10E+01 8.20E+01 PASS 1.15E+02 5.45E+00 1.26E+02 1.03E+02 8.20E+01 PASS 1.20E+02 7.58E+00 1.36E+02 1.04E+02 8.20E+01 PASS 1.16E+02 1.06E+01 1.38E+02 9.46E+01 8.20E+01 PASS 1.18E+02 6.51E+00 1.31E+02 1.04E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 92 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 4:1 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.44. Plot of Channel Separation @+/-5V 4:1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 93 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.44. Raw data for Channel Separation @+/-5V 4:1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 4:1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.11E+02 1.39E+02 1.03E+02 1.06E+02 1.10E+02 1.12E+02 1.08E+02 1.13E+02 1.10E+02 1.17E+02 1.10E+02 1.26E+02 10 1.08E+02 1.16E+02 1.07E+02 1.15E+02 1.16E+02 1.17E+02 1.05E+02 1.09E+02 1.04E+02 1.02E+02 1.09E+02 1.10E+02 20 1.11E+02 1.23E+02 1.07E+02 1.29E+02 1.25E+02 1.08E+02 1.10E+02 1.00E+02 1.03E+02 1.04E+02 1.07E+02 1.11E+02 30 1.08E+02 1.04E+02 1.04E+02 1.45E+02 1.10E+02 1.13E+02 1.25E+02 1.12E+02 1.05E+02 1.16E+02 1.29E+02 1.16E+02 40 1.24E+02 1.04E+02 1.04E+02 1.09E+02 1.07E+02 1.04E+02 1.29E+02 1.09E+02 1.07E+02 1.13E+02 1.10E+02 1.19E+02 50 1.09E+02 1.17E+02 1.03E+02 1.09E+02 1.07E+02 1.11E+02 1.08E+02 1.08E+02 1.10E+02 1.06E+02 1.13E+02 1.30E+02 60 1.08E+02 1.16E+02 9.96E+01 1.29E+02 1.10E+02 1.08E+02 1.19E+02 1.43E+02 1.26E+02 1.06E+02 1.04E+02 1.08E+02 70 1.18E+02 1.02E+02 1.02E+02 1.10E+02 1.08E+02 1.19E+02 1.13E+02 1.11E+02 1.05E+02 1.05E+02 1.18E+02 1.11E+02 75 1.24E+02 1.08E+02 1.06E+02 1.18E+02 1.06E+02 1.04E+02 1.26E+02 1.04E+02 1.11E+02 1.06E+02 1.11E+02 1.21E+02 100 1.11E+02 1.06E+02 1.04E+02 1.04E+02 1.29E+02 1.18E+02 1.19E+02 1.20E+02 1.17E+02 1.03E+02 1.00E+02 1.10E+02 200 1.27E+02 1.08E+02 1.07E+02 1.09E+02 1.15E+02 1.10E+02 1.04E+02 1.11E+02 1.13E+02 1.08E+02 1.11E+02 1.09E+02 1.13E+02 9.85E+00 1.33E+02 9.25E+01 8.20E+01 PASS 1.10E+02 5.57E+00 1.21E+02 9.84E+01 8.20E+01 PASS 1.12E+02 1.01E+01 1.33E+02 9.12E+01 8.20E+01 PASS 1.14E+02 1.25E+01 1.40E+02 8.82E+01 8.20E+01 PASS 1.11E+02 8.49E+00 1.28E+02 9.34E+01 8.20E+01 PASS 1.09E+02 3.57E+00 1.16E+02 1.01E+02 8.20E+01 PASS 1.17E+02 1.31E+01 1.44E+02 8.94E+01 8.20E+01 PASS 1.09E+02 6.12E+00 1.22E+02 9.66E+01 8.20E+01 PASS 1.11E+02 8.09E+00 1.28E+02 9.46E+01 8.20E+01 PASS 1.13E+02 8.82E+00 1.31E+02 9.49E+01 8.20E+01 PASS 1.11E+02 6.50E+00 1.25E+02 9.77E+01 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 94 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 4:2 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.45. Plot of Channel Separation @+/-5V 4:2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 95 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.45. Raw data for Channel Separation @+/-5V 4:2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 4:2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.14E+02 1.22E+02 1.48E+02 1.29E+02 1.15E+02 1.20E+02 1.16E+02 1.17E+02 1.12E+02 1.12E+02 1.18E+02 1.12E+02 10 1.11E+02 1.40E+02 1.14E+02 1.23E+02 1.20E+02 1.09E+02 1.09E+02 1.65E+02 1.18E+02 1.14E+02 1.30E+02 1.16E+02 20 1.15E+02 1.13E+02 1.15E+02 1.15E+02 1.27E+02 1.14E+02 1.19E+02 1.17E+02 1.13E+02 1.09E+02 1.05E+02 1.20E+02 30 1.15E+02 1.21E+02 1.15E+02 1.08E+02 1.15E+02 1.26E+02 1.10E+02 1.13E+02 1.35E+02 1.17E+02 1.38E+02 1.21E+02 40 1.14E+02 1.14E+02 1.31E+02 1.15E+02 1.16E+02 1.17E+02 1.20E+02 1.15E+02 1.21E+02 1.19E+02 1.15E+02 1.08E+02 50 1.17E+02 1.11E+02 1.13E+02 1.09E+02 1.09E+02 1.15E+02 1.08E+02 1.12E+02 1.05E+02 1.14E+02 1.23E+02 1.20E+02 60 1.09E+02 1.16E+02 1.14E+02 1.13E+02 1.23E+02 1.32E+02 1.75E+02 1.12E+02 1.16E+02 1.08E+02 1.24E+02 1.22E+02 70 1.09E+02 1.15E+02 1.13E+02 1.06E+02 1.24E+02 1.14E+02 1.23E+02 1.19E+02 1.14E+02 1.11E+02 1.19E+02 1.15E+02 75 1.23E+02 1.25E+02 1.28E+02 1.13E+02 1.19E+02 1.16E+02 1.15E+02 1.23E+02 1.14E+02 1.24E+02 1.24E+02 1.16E+02 100 1.22E+02 1.18E+02 1.13E+02 1.11E+02 1.28E+02 1.25E+02 1.11E+02 1.19E+02 1.08E+02 1.12E+02 1.17E+02 1.12E+02 200 1.18E+02 1.25E+02 1.15E+02 1.17E+02 1.13E+02 1.22E+02 1.06E+02 1.14E+02 1.15E+02 1.31E+02 1.15E+02 1.09E+02 1.20E+02 1.09E+01 1.43E+02 9.80E+01 8.20E+01 PASS 1.22E+02 1.74E+01 1.58E+02 8.63E+01 8.20E+01 PASS 1.16E+02 4.73E+00 1.25E+02 1.06E+02 8.20E+01 PASS 1.17E+02 7.89E+00 1.34E+02 1.01E+02 8.20E+01 PASS 1.18E+02 5.25E+00 1.29E+02 1.07E+02 8.20E+01 PASS 1.11E+02 3.79E+00 1.19E+02 1.04E+02 8.20E+01 PASS 1.22E+02 2.00E+01 1.63E+02 8.04E+01 8.20E+01 PASS 1.15E+02 5.70E+00 1.27E+02 1.03E+02 8.20E+01 PASS 1.20E+02 5.12E+00 1.30E+02 1.09E+02 8.20E+01 PASS 1.17E+02 6.77E+00 1.31E+02 1.03E+02 8.20E+01 PASS 1.18E+02 7.04E+00 1.32E+02 1.03E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 96 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @+/-5V 4:3 (dB) 1.40E+02 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.46. Plot of Channel Separation @+/-5V 4:3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 97 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.46. Raw data for Channel Separation @+/-5V 4:3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @+/-5V 4:3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.21E+02 1.34E+02 1.30E+02 1.12E+02 1.20E+02 1.14E+02 1.11E+02 1.30E+02 1.23E+02 1.10E+02 1.08E+02 1.18E+02 10 1.16E+02 1.08E+02 1.08E+02 1.12E+02 1.14E+02 1.12E+02 1.27E+02 1.10E+02 1.14E+02 1.11E+02 1.22E+02 1.10E+02 20 1.19E+02 1.24E+02 1.22E+02 1.22E+02 1.03E+02 1.20E+02 1.22E+02 1.34E+02 1.32E+02 1.16E+02 1.10E+02 1.11E+02 30 1.20E+02 1.13E+02 1.11E+02 1.08E+02 1.25E+02 1.20E+02 1.20E+02 1.09E+02 1.16E+02 1.17E+02 1.11E+02 1.12E+02 40 1.17E+02 1.14E+02 1.19E+02 1.17E+02 1.16E+02 1.06E+02 1.22E+02 1.23E+02 1.38E+02 1.08E+02 1.05E+02 1.14E+02 50 1.06E+02 1.13E+02 1.20E+02 1.21E+02 1.13E+02 1.18E+02 1.08E+02 1.26E+02 1.14E+02 1.09E+02 1.21E+02 1.23E+02 60 1.10E+02 1.20E+02 1.13E+02 1.11E+02 1.31E+02 1.12E+02 1.15E+02 1.15E+02 1.10E+02 1.04E+02 1.20E+02 1.17E+02 70 1.14E+02 1.09E+02 1.15E+02 1.06E+02 1.07E+02 1.19E+02 1.08E+02 1.10E+02 1.23E+02 1.19E+02 1.28E+02 1.20E+02 75 1.06E+02 1.10E+02 1.20E+02 1.10E+02 1.16E+02 1.18E+02 1.28E+02 1.19E+02 1.20E+02 1.05E+02 1.16E+02 1.07E+02 100 1.06E+02 1.14E+02 1.08E+02 1.22E+02 1.15E+02 1.14E+02 1.15E+02 1.28E+02 1.12E+02 1.27E+02 1.16E+02 1.33E+02 200 1.15E+02 1.11E+02 1.20E+02 1.12E+02 1.12E+02 1.15E+02 1.10E+02 1.13E+02 1.17E+02 1.13E+02 1.11E+02 1.10E+02 1.20E+02 8.66E+00 1.38E+02 1.02E+02 8.20E+01 PASS 1.13E+02 5.60E+00 1.25E+02 1.02E+02 8.20E+01 PASS 1.21E+02 8.59E+00 1.39E+02 1.04E+02 8.20E+01 PASS 1.16E+02 5.53E+00 1.27E+02 1.04E+02 8.20E+01 PASS 1.18E+02 8.93E+00 1.36E+02 9.94E+01 8.20E+01 PASS 1.15E+02 6.29E+00 1.28E+02 1.02E+02 8.20E+01 PASS 1.14E+02 7.25E+00 1.29E+02 9.91E+01 8.20E+01 PASS 1.13E+02 5.88E+00 1.25E+02 1.01E+02 8.20E+01 PASS 1.15E+02 7.12E+00 1.30E+02 1.00E+02 8.20E+01 PASS 1.16E+02 7.44E+00 1.31E+02 1.01E+02 8.20E+01 PASS 1.14E+02 3.10E+00 1.20E+02 1.07E+02 8.20E+01 PASS An ISO 9001:2008 and DSCC Certified Company 98 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=500 #1 (V) 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.47. Plot of Output Voltage Swing High @+/-5V RL=500 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 99 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.47. Raw data for Output Voltage Swing High @+/-5V RL=500 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=500 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.02E+00 4.02E+00 4.03E+00 4.03E+00 4.03E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.03E+00 10 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 20 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 30 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 40 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 50 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 60 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 70 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 75 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 100 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 200 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.02E+00 4.02E+00 4.02E+00 2.33E-03 4.03E+00 4.02E+00 3.80E+00 PASS 4.02E+00 2.33E-03 4.02E+00 4.02E+00 3.80E+00 PASS 4.02E+00 2.64E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.44E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.16E-03 4.02E+00 4.02E+00 3.80E+00 PASS 4.02E+00 2.20E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 1.96E-03 4.02E+00 4.02E+00 3.70E+00 PASS 4.02E+00 1.85E-03 4.02E+00 4.02E+00 3.70E+00 PASS 4.02E+00 2.06E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.01E-03 4.02E+00 4.01E+00 3.60E+00 PASS 4.01E+00 1.90E-03 4.01E+00 4.01E+00 3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 100 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=500 #2 (V) 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.48. Plot of Output Voltage Swing High @+/-5V RL=500 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 101 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.48. Raw data for Output Voltage Swing High @+/-5V RL=500 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=500 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 10 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 20 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 30 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 40 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 50 4.01E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 60 4.01E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 70 4.01E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 75 4.01E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 100 4.01E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 200 4.01E+00 4.01E+00 4.01E+00 4.02E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.02E+00 4.02E+00 4.02E+00 2.08E-03 4.03E+00 4.02E+00 3.80E+00 PASS 4.02E+00 2.36E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.63E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.25E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.41E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.59E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.59E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.59E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.39E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.47E-03 4.02E+00 4.01E+00 3.60E+00 PASS 4.01E+00 2.50E-03 4.02E+00 4.01E+00 3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 102 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=500 #3 (V) 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.49. Plot of Output Voltage Swing High @+/-5V RL=500 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 103 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.49. Raw data for Output Voltage Swing High @+/-5V RL=500 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=500 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 10 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 20 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 30 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 40 4.02E+00 4.02E+00 4.02E+00 4.03E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 50 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 60 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 70 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 75 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 100 4.01E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 200 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.02E+00 4.02E+00 4.02E+00 2.80E-03 4.03E+00 4.02E+00 3.80E+00 PASS 4.02E+00 2.64E-03 4.02E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.92E-03 4.03E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.80E-03 4.03E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.79E-03 4.03E+00 4.01E+00 3.80E+00 PASS 4.02E+00 2.54E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.58E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.36E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.13E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 2.31E-03 4.02E+00 4.01E+00 3.60E+00 PASS 4.01E+00 2.32E-03 4.02E+00 4.01E+00 3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 104 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=500 #4 (V) 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.50. Plot of Output Voltage Swing High @+/-5V RL=500 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 105 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.50. Raw data for Output Voltage Swing High @+/-5V RL=500 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=500 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 10 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 20 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 30 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 40 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 50 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 60 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 70 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 75 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 100 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.02E+00 4.01E+00 4.02E+00 4.02E+00 200 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.01E+00 4.02E+00 4.02E+00 4.02E+00 1.42E-03 4.03E+00 4.02E+00 3.80E+00 PASS 4.02E+00 1.34E-03 4.02E+00 4.02E+00 3.80E+00 PASS 4.02E+00 1.57E-03 4.02E+00 4.02E+00 3.80E+00 PASS 4.02E+00 1.57E-03 4.02E+00 4.02E+00 3.80E+00 PASS 4.02E+00 1.51E-03 4.02E+00 4.02E+00 3.80E+00 PASS 4.02E+00 1.49E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 1.33E-03 4.02E+00 4.02E+00 3.70E+00 PASS 4.02E+00 1.29E-03 4.02E+00 4.02E+00 3.70E+00 PASS 4.02E+00 1.65E-03 4.02E+00 4.01E+00 3.70E+00 PASS 4.02E+00 1.81E-03 4.02E+00 4.01E+00 3.60E+00 PASS 4.01E+00 2.32E-03 4.01E+00 4.00E+00 3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 106 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=100 #1 (V) 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 3.20E+00 3.10E+00 3.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.51. Plot of Output Voltage Swing High @+/-5V RL=100 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 107 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.51. Raw data for Output Voltage Swing High @+/-5V RL=100 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=100 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.64E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 10 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 20 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 30 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 40 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 50 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 60 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 70 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 75 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.61E+00 3.61E+00 3.62E+00 3.62E+00 3.61E+00 3.63E+00 3.63E+00 100 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.61E+00 3.61E+00 3.62E+00 3.62E+00 3.61E+00 3.63E+00 3.63E+00 200 3.61E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.61E+00 3.60E+00 3.61E+00 3.61E+00 3.61E+00 3.63E+00 3.63E+00 3.63E+00 6.29E-03 3.64E+00 3.61E+00 3.35E+00 PASS 3.62E+00 6.26E-03 3.64E+00 3.61E+00 3.35E+00 PASS 3.62E+00 6.52E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 6.41E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 6.58E-03 3.63E+00 3.61E+00 3.30E+00 PASS 3.62E+00 6.27E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.36E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.02E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.14E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.13E-03 3.63E+00 3.61E+00 3.15E+00 PASS 3.61E+00 5.78E-03 3.62E+00 3.60E+00 3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 108 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=100 #2 (V) 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 3.20E+00 3.10E+00 3.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.52. Plot of Output Voltage Swing High @+/-5V RL=100 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 109 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.52. Raw data for Output Voltage Swing High @+/-5V RL=100 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=100 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.62E+00 3.62E+00 3.63E+00 3.64E+00 3.63E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 10 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 20 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 30 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 40 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 50 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 60 3.61E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 70 3.61E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 75 3.61E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 100 3.61E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 200 3.60E+00 3.61E+00 3.61E+00 3.63E+00 3.61E+00 3.61E+00 3.61E+00 3.61E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 6.07E-03 3.64E+00 3.61E+00 3.35E+00 PASS 3.62E+00 6.36E-03 3.64E+00 3.61E+00 3.35E+00 PASS 3.62E+00 6.55E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 6.67E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 6.77E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 6.83E-03 3.64E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.68E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.67E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.69E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.73E-03 3.63E+00 3.60E+00 3.15E+00 PASS 3.61E+00 7.09E-03 3.63E+00 3.60E+00 3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 110 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=100 #3 (V) 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 3.20E+00 3.10E+00 3.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.53. Plot of Output Voltage Swing High @+/-5V RL=100 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 111 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.53. Raw data for Output Voltage Swing High @+/-5V RL=100 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=100 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.62E+00 3.63E+00 3.63E+00 3.64E+00 3.63E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.64E+00 3.63E+00 3.62E+00 10 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 20 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 30 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 40 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 50 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 60 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 70 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 75 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 100 3.61E+00 3.62E+00 3.62E+00 3.64E+00 3.62E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 200 3.60E+00 3.61E+00 3.61E+00 3.63E+00 3.61E+00 3.61E+00 3.61E+00 3.61E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 7.18E-03 3.64E+00 3.61E+00 3.35E+00 PASS 3.62E+00 7.29E-03 3.64E+00 3.61E+00 3.35E+00 PASS 3.62E+00 7.20E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 7.52E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 7.10E-03 3.64E+00 3.61E+00 3.30E+00 PASS 3.62E+00 7.29E-03 3.64E+00 3.61E+00 3.25E+00 PASS 3.62E+00 7.06E-03 3.64E+00 3.61E+00 3.25E+00 PASS 3.62E+00 7.06E-03 3.64E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.79E-03 3.64E+00 3.61E+00 3.25E+00 PASS 3.62E+00 6.93E-03 3.63E+00 3.61E+00 3.15E+00 PASS 3.61E+00 6.72E-03 3.63E+00 3.60E+00 3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 112 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @+/-5V RL=100 #4 (V) 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 3.20E+00 3.10E+00 3.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.54. Plot of Output Voltage Swing High @+/-5V RL=100 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 113 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.54. Raw data for Output Voltage Swing High @+/-5V RL=100 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @+/-5V RL=100 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.62E+00 3.63E+00 3.63E+00 10 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 20 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 30 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 40 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 50 3.62E+00 3.62E+00 3.63E+00 3.63E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 60 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 70 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.63E+00 75 3.62E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.61E+00 3.63E+00 3.63E+00 100 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.63E+00 3.61E+00 3.62E+00 3.62E+00 3.62E+00 3.61E+00 3.63E+00 3.63E+00 200 3.61E+00 3.61E+00 3.62E+00 3.61E+00 3.62E+00 3.60E+00 3.61E+00 3.61E+00 3.61E+00 3.60E+00 3.63E+00 3.63E+00 3.63E+00 4.03E-03 3.63E+00 3.62E+00 3.35E+00 PASS 3.62E+00 4.07E-03 3.63E+00 3.61E+00 3.35E+00 PASS 3.62E+00 4.50E-03 3.63E+00 3.61E+00 3.30E+00 PASS 3.62E+00 4.53E-03 3.63E+00 3.61E+00 3.30E+00 PASS 3.62E+00 4.71E-03 3.63E+00 3.61E+00 3.30E+00 PASS 3.62E+00 4.48E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 4.58E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 4.45E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 4.61E-03 3.63E+00 3.61E+00 3.25E+00 PASS 3.62E+00 4.58E-03 3.63E+00 3.61E+00 3.15E+00 PASS 3.61E+00 4.81E-03 3.62E+00 3.60E+00 3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 114 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=500 #1 (V) -3.40E+00 -3.50E+00 -3.60E+00 -3.70E+00 -3.80E+00 -3.90E+00 -4.00E+00 -4.10E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.55. Plot of Output Voltage Swing Low @+/-5V RL=500 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 115 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.55. Raw data for Output Voltage Swing Low @+/-5V RL=500 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=500 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -4.02E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.02E+00 -4.03E+00 -4.02E+00 10 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 20 -4.02E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 30 -4.02E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 40 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 50 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 60 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 70 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.03E+00 -4.02E+00 75 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 100 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 200 -4.01E+00 -4.00E+00 -4.00E+00 -4.01E+00 -4.01E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.03E+00 -4.02E+00 -4.03E+00 1.96E-03 -4.02E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 2.80E-03 -4.01E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 3.60E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.02E+00 3.74E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.02E+00 3.41E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.02E+00 3.41E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.23E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.28E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.40E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.26E-03 -4.00E+00 -4.02E+00 -3.60E+00 PASS -4.00E+00 3.55E-03 -4.00E+00 -4.01E+00 -3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 116 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=500 #2 (V) -3.40E+00 -3.50E+00 -3.60E+00 -3.70E+00 -3.80E+00 -3.90E+00 -4.00E+00 -4.10E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.56. Plot of Output Voltage Swing Low @+/-5V RL=500 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 117 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.56. Raw data for Output Voltage Swing Low @+/-5V RL=500 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=500 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -4.02E+00 -4.02E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.02E+00 -4.03E+00 -4.03E+00 -4.01E+00 -4.03E+00 -4.03E+00 -4.02E+00 10 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 20 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 30 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 40 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 50 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 60 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 70 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 75 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 100 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 200 -4.00E+00 -4.00E+00 -4.00E+00 -4.01E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.01E+00 -4.00E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 5.74E-03 -4.01E+00 -4.04E+00 -3.80E+00 PASS -4.02E+00 5.79E-03 -4.01E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 5.12E-03 -4.00E+00 -4.03E+00 -3.80E+00 PASS -4.01E+00 4.27E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.01E+00 3.97E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.01E+00 3.60E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.53E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.57E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.33E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.58E-03 -4.00E+00 -4.02E+00 -3.60E+00 PASS -4.00E+00 3.53E-03 -4.00E+00 -4.01E+00 -3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 118 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=500 #3 (V) -3.40E+00 -3.50E+00 -3.60E+00 -3.70E+00 -3.80E+00 -3.90E+00 -4.00E+00 -4.10E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.57. Plot of Output Voltage Swing Low @+/-5V RL=500 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 119 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.57. Raw data for Output Voltage Swing Low @+/-5V RL=500 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=500 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -4.02E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.02E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.02E+00 10 -4.01E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 20 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 30 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 40 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 50 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 60 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 70 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 75 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 100 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 200 -4.00E+00 -4.00E+00 -4.00E+00 -4.01E+00 -4.00E+00 -4.00E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 -4.03E+00 3.31E-03 -4.02E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 4.48E-03 -4.01E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 4.64E-03 -4.01E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 4.47E-03 -4.01E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 4.06E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.02E+00 3.84E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.02E+00 3.57E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.63E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.79E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.63E-03 -4.00E+00 -4.02E+00 -3.60E+00 PASS -4.01E+00 3.78E-03 -4.00E+00 -4.01E+00 -3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 120 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=500 #4 (V) -3.40E+00 -3.50E+00 -3.60E+00 -3.70E+00 -3.80E+00 -3.90E+00 -4.00E+00 -4.10E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.58. Plot of Output Voltage Swing Low @+/-5V RL=500 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 121 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.58. Raw data for Output Voltage Swing Low @+/-5V RL=500 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=500 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -4.02E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.03E+00 -4.02E+00 -4.03E+00 -4.03E+00 -4.02E+00 -4.03E+00 -4.02E+00 10 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.03E+00 -4.02E+00 20 -4.01E+00 -4.01E+00 -4.02E+00 -4.03E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.01E+00 -4.03E+00 -4.02E+00 30 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 40 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 50 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 60 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 70 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 75 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 100 -4.01E+00 -4.01E+00 -4.01E+00 -4.02E+00 -4.02E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.03E+00 -4.02E+00 200 -4.00E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.01E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.00E+00 -4.03E+00 -4.02E+00 -4.03E+00 2.21E-03 -4.02E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 3.44E-03 -4.01E+00 -4.03E+00 -3.80E+00 PASS -4.02E+00 4.30E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.01E+00 4.20E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.01E+00 4.11E-03 -4.01E+00 -4.02E+00 -3.80E+00 PASS -4.01E+00 4.00E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.66E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.46E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.53E-03 -4.01E+00 -4.02E+00 -3.70E+00 PASS -4.01E+00 3.44E-03 -4.00E+00 -4.02E+00 -3.60E+00 PASS -4.00E+00 3.98E-03 -3.99E+00 -4.01E+00 -3.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 122 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=100 #1 (V) -3.00E+00 -3.10E+00 -3.20E+00 -3.30E+00 -3.40E+00 -3.50E+00 -3.60E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.59. Plot of Output Voltage Swing Low @+/-5V RL=100 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 123 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.59. Raw data for Output Voltage Swing Low @+/-5V RL=100 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=100 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.55E+00 -3.55E+00 -3.56E+00 -3.56E+00 -3.56E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.55E+00 10 -3.54E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.53E+00 -3.53E+00 -3.53E+00 -3.53E+00 -3.54E+00 -3.55E+00 -3.54E+00 20 -3.54E+00 -3.52E+00 -3.53E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.55E+00 -3.54E+00 30 -3.53E+00 -3.52E+00 -3.53E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.55E+00 -3.54E+00 40 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 50 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 60 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 70 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 75 -3.53E+00 -3.53E+00 -3.54E+00 -3.55E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 100 -3.53E+00 -3.53E+00 -3.54E+00 -3.55E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.52E+00 -3.55E+00 -3.54E+00 200 -3.52E+00 -3.51E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.51E+00 -3.50E+00 -3.50E+00 -3.51E+00 -3.50E+00 -3.55E+00 -3.54E+00 -3.55E+00 6.11E-03 -3.54E+00 -3.57E+00 -3.35E+00 PASS -3.54E+00 1.17E-02 -3.51E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.40E-02 -3.50E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.45E-02 -3.50E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.38E-02 -3.50E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.35E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.54E+00 1.32E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.54E+00 1.28E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.53E+00 1.29E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.53E+00 1.27E-02 -3.51E+00 -3.56E+00 -3.15E+00 PASS -3.52E+00 1.46E-02 -3.49E+00 -3.55E+00 -3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 124 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=100 #2 (V) -3.00E+00 -3.10E+00 -3.20E+00 -3.30E+00 -3.40E+00 -3.50E+00 -3.60E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.60. Plot of Output Voltage Swing Low @+/-5V RL=100 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 125 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.60. Raw data for Output Voltage Swing Low @+/-5V RL=100 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=100 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.54E+00 -3.53E+00 -3.55E+00 -3.57E+00 -3.56E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.52E+00 -3.56E+00 -3.55E+00 -3.54E+00 10 -3.52E+00 -3.51E+00 -3.54E+00 -3.57E+00 -3.55E+00 -3.53E+00 -3.53E+00 -3.54E+00 -3.51E+00 -3.56E+00 -3.54E+00 -3.54E+00 20 -3.51E+00 -3.51E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.53E+00 -3.52E+00 -3.53E+00 -3.51E+00 -3.55E+00 -3.54E+00 -3.54E+00 30 -3.51E+00 -3.52E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.52E+00 -3.55E+00 -3.54E+00 -3.54E+00 40 -3.51E+00 -3.53E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 -3.54E+00 50 -3.51E+00 -3.53E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.52E+00 -3.53E+00 -3.54E+00 -3.53E+00 -3.55E+00 -3.54E+00 -3.54E+00 60 -3.52E+00 -3.53E+00 -3.54E+00 -3.57E+00 -3.54E+00 -3.52E+00 -3.53E+00 -3.54E+00 -3.53E+00 -3.56E+00 -3.54E+00 -3.54E+00 70 -3.52E+00 -3.53E+00 -3.54E+00 -3.57E+00 -3.54E+00 -3.52E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.54E+00 -3.54E+00 75 -3.52E+00 -3.53E+00 -3.54E+00 -3.57E+00 -3.54E+00 -3.52E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.54E+00 -3.54E+00 100 -3.52E+00 -3.53E+00 -3.53E+00 -3.56E+00 -3.54E+00 -3.52E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.54E+00 -3.54E+00 200 -3.50E+00 -3.52E+00 -3.52E+00 -3.54E+00 -3.52E+00 -3.50E+00 -3.52E+00 -3.53E+00 -3.52E+00 -3.55E+00 -3.54E+00 -3.54E+00 -3.55E+00 1.66E-02 -3.51E+00 -3.58E+00 -3.35E+00 PASS -3.54E+00 1.92E-02 -3.50E+00 -3.57E+00 -3.30E+00 PASS -3.53E+00 1.91E-02 -3.49E+00 -3.57E+00 -3.30E+00 PASS -3.53E+00 1.78E-02 -3.49E+00 -3.57E+00 -3.30E+00 PASS -3.53E+00 1.70E-02 -3.50E+00 -3.57E+00 -3.30E+00 PASS -3.54E+00 1.57E-02 -3.50E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.49E-02 -3.51E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.46E-02 -3.51E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.44E-02 -3.51E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.41E-02 -3.51E+00 -3.57E+00 -3.15E+00 PASS -3.52E+00 1.52E-02 -3.49E+00 -3.55E+00 -3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 126 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=100 #3 (V) -3.00E+00 -3.10E+00 -3.20E+00 -3.30E+00 -3.40E+00 -3.50E+00 -3.60E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.61. Plot of Output Voltage Swing Low @+/-5V RL=100 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 127 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.61. Raw data for Output Voltage Swing Low @+/-5V RL=100 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=100 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.53E+00 -3.55E+00 -3.55E+00 -3.58E+00 -3.56E+00 -3.55E+00 -3.55E+00 -3.56E+00 -3.56E+00 -3.57E+00 -3.55E+00 -3.55E+00 10 -3.50E+00 -3.53E+00 -3.54E+00 -3.58E+00 -3.55E+00 -3.54E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.54E+00 20 -3.50E+00 -3.53E+00 -3.53E+00 -3.58E+00 -3.54E+00 -3.53E+00 -3.52E+00 -3.54E+00 -3.53E+00 -3.55E+00 -3.55E+00 -3.54E+00 30 -3.51E+00 -3.53E+00 -3.53E+00 -3.58E+00 -3.54E+00 -3.53E+00 -3.52E+00 -3.54E+00 -3.53E+00 -3.55E+00 -3.55E+00 -3.54E+00 40 -3.51E+00 -3.53E+00 -3.53E+00 -3.58E+00 -3.54E+00 -3.53E+00 -3.52E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.54E+00 50 -3.52E+00 -3.54E+00 -3.53E+00 -3.58E+00 -3.54E+00 -3.53E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.54E+00 60 -3.52E+00 -3.54E+00 -3.53E+00 -3.58E+00 -3.54E+00 -3.53E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.54E+00 70 -3.52E+00 -3.54E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.53E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.55E+00 75 -3.52E+00 -3.54E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.53E+00 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.54E+00 100 -3.52E+00 -3.54E+00 -3.53E+00 -3.57E+00 -3.54E+00 -3.53E+00 -3.53E+00 -3.55E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.54E+00 200 -3.50E+00 -3.52E+00 -3.51E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.54E+00 -3.53E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.55E+00 1.34E-02 -3.53E+00 -3.58E+00 -3.35E+00 PASS -3.54E+00 1.89E-02 -3.50E+00 -3.58E+00 -3.30E+00 PASS -3.54E+00 1.93E-02 -3.50E+00 -3.58E+00 -3.30E+00 PASS -3.53E+00 1.91E-02 -3.50E+00 -3.57E+00 -3.30E+00 PASS -3.54E+00 1.78E-02 -3.50E+00 -3.57E+00 -3.30E+00 PASS -3.54E+00 1.66E-02 -3.50E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.62E-02 -3.51E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.55E-02 -3.51E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.52E-02 -3.51E+00 -3.57E+00 -3.25E+00 PASS -3.54E+00 1.52E-02 -3.51E+00 -3.57E+00 -3.15E+00 PASS -3.53E+00 1.65E-02 -3.49E+00 -3.56E+00 -3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 128 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @+/-5V RL=100 #4 (V) -3.00E+00 -3.10E+00 -3.20E+00 -3.30E+00 -3.40E+00 -3.50E+00 -3.60E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.62. Plot of Output Voltage Swing Low @+/-5V RL=100 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 129 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.62. Raw data for Output Voltage Swing Low @+/-5V RL=100 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @+/-5V RL=100 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.55E+00 -3.55E+00 -3.56E+00 -3.56E+00 -3.57E+00 -3.55E+00 -3.54E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.56E+00 -3.54E+00 10 -3.54E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.56E+00 -3.53E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.53E+00 -3.56E+00 -3.53E+00 20 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.55E+00 -3.53E+00 30 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.51E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.56E+00 -3.53E+00 40 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.56E+00 -3.53E+00 50 -3.53E+00 -3.53E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.56E+00 -3.53E+00 60 -3.53E+00 -3.54E+00 -3.54E+00 -3.56E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.56E+00 -3.53E+00 70 -3.53E+00 -3.54E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.56E+00 -3.53E+00 75 -3.53E+00 -3.53E+00 -3.54E+00 -3.55E+00 -3.55E+00 -3.53E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.53E+00 -3.56E+00 -3.53E+00 100 -3.53E+00 -3.53E+00 -3.55E+00 -3.55E+00 -3.55E+00 -3.52E+00 -3.52E+00 -3.52E+00 -3.53E+00 -3.52E+00 -3.56E+00 -3.53E+00 200 -3.52E+00 -3.52E+00 -3.54E+00 -3.53E+00 -3.54E+00 -3.51E+00 -3.50E+00 -3.50E+00 -3.51E+00 -3.50E+00 -3.56E+00 -3.53E+00 -3.55E+00 7.12E-03 -3.54E+00 -3.57E+00 -3.35E+00 PASS -3.54E+00 1.23E-02 -3.51E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.49E-02 -3.50E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.48E-02 -3.50E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.41E-02 -3.50E+00 -3.56E+00 -3.30E+00 PASS -3.53E+00 1.36E-02 -3.50E+00 -3.56E+00 -3.25E+00 PASS -3.53E+00 1.30E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.53E+00 1.29E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.53E+00 1.24E-02 -3.51E+00 -3.56E+00 -3.25E+00 PASS -3.53E+00 1.21E-02 -3.51E+00 -3.56E+00 -3.15E+00 PASS -3.52E+00 1.51E-02 -3.49E+00 -3.55E+00 -3.05E+00 PASS An ISO 9001:2008 and DSCC Certified Company 130 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @+/-5V #1 (A) 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.63. Plot of Maximum Output Source Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 131 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.63. Raw data for Maximum Output Source Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 6.02E-02 6.17E-02 6.23E-02 6.31E-02 6.36E-02 6.01E-02 5.99E-02 6.06E-02 6.11E-02 6.04E-02 6.13E-02 6.19E-02 10 6.02E-02 6.17E-02 6.23E-02 6.32E-02 6.36E-02 6.01E-02 5.99E-02 6.07E-02 6.12E-02 6.05E-02 6.16E-02 6.22E-02 20 6.02E-02 6.17E-02 6.24E-02 6.31E-02 6.35E-02 6.01E-02 5.99E-02 6.06E-02 6.12E-02 6.04E-02 6.16E-02 6.22E-02 30 6.01E-02 6.16E-02 6.23E-02 6.30E-02 6.35E-02 6.00E-02 5.96E-02 6.06E-02 6.11E-02 6.02E-02 6.16E-02 6.22E-02 40 6.01E-02 6.15E-02 6.22E-02 6.29E-02 6.34E-02 5.99E-02 5.96E-02 6.05E-02 6.10E-02 6.02E-02 6.16E-02 6.22E-02 50 6.00E-02 6.13E-02 6.22E-02 6.28E-02 6.33E-02 5.99E-02 5.94E-02 6.04E-02 6.10E-02 6.01E-02 6.16E-02 6.22E-02 60 5.99E-02 6.13E-02 6.20E-02 6.27E-02 6.31E-02 5.97E-02 5.94E-02 6.02E-02 6.08E-02 6.01E-02 6.16E-02 6.22E-02 70 5.98E-02 6.12E-02 6.20E-02 6.25E-02 6.30E-02 5.96E-02 5.93E-02 6.02E-02 6.08E-02 6.00E-02 6.16E-02 6.22E-02 75 5.98E-02 6.12E-02 6.20E-02 6.25E-02 6.30E-02 5.96E-02 5.92E-02 6.01E-02 6.08E-02 5.99E-02 6.16E-02 6.22E-02 100 5.95E-02 6.09E-02 6.17E-02 6.22E-02 6.27E-02 5.93E-02 5.88E-02 5.99E-02 6.05E-02 5.96E-02 6.15E-02 6.21E-02 200 5.85E-02 6.00E-02 6.10E-02 6.10E-02 6.17E-02 5.82E-02 5.75E-02 5.89E-02 5.98E-02 5.88E-02 6.15E-02 6.21E-02 6.13E-02 1.32E-03 6.40E-02 5.86E-02 4.00E-02 PASS 6.13E-02 1.32E-03 6.41E-02 5.86E-02 4.00E-02 PASS 6.13E-02 1.32E-03 6.40E-02 5.86E-02 4.00E-02 PASS 6.12E-02 1.35E-03 6.40E-02 5.84E-02 4.00E-02 PASS 6.11E-02 1.32E-03 6.38E-02 5.84E-02 4.00E-02 PASS 6.10E-02 1.33E-03 6.38E-02 5.83E-02 4.00E-02 PASS 6.09E-02 1.31E-03 6.36E-02 5.82E-02 4.00E-02 PASS 6.08E-02 1.31E-03 6.35E-02 5.81E-02 4.00E-02 PASS 6.08E-02 1.34E-03 6.36E-02 5.80E-02 4.00E-02 PASS 6.05E-02 1.32E-03 6.32E-02 5.78E-02 4.00E-02 PASS 5.95E-02 1.37E-03 6.24E-02 5.67E-02 4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 132 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @+/-5V #2 (A) 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.64. Plot of Maximum Output Source Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 133 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.64. Raw data for Maximum Output Source Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 5.99E-02 6.16E-02 6.11E-02 6.39E-02 6.14E-02 6.01E-02 6.15E-02 6.18E-02 6.18E-02 6.34E-02 6.07E-02 5.99E-02 10 5.96E-02 6.16E-02 6.11E-02 6.40E-02 6.15E-02 6.01E-02 6.15E-02 6.20E-02 6.19E-02 6.35E-02 6.08E-02 6.01E-02 20 5.97E-02 6.16E-02 6.12E-02 6.41E-02 6.15E-02 6.02E-02 6.16E-02 6.19E-02 6.19E-02 6.35E-02 6.09E-02 6.01E-02 30 5.95E-02 6.14E-02 6.11E-02 6.40E-02 6.13E-02 6.01E-02 6.15E-02 6.19E-02 6.18E-02 6.33E-02 6.08E-02 6.01E-02 40 5.94E-02 6.13E-02 6.10E-02 6.40E-02 6.12E-02 6.00E-02 6.13E-02 6.18E-02 6.18E-02 6.31E-02 6.09E-02 6.01E-02 50 5.93E-02 6.13E-02 6.09E-02 6.39E-02 6.11E-02 6.00E-02 6.13E-02 6.18E-02 6.17E-02 6.31E-02 6.09E-02 6.01E-02 60 5.92E-02 6.12E-02 6.08E-02 6.39E-02 6.11E-02 5.99E-02 6.11E-02 6.17E-02 6.17E-02 6.30E-02 6.08E-02 6.01E-02 70 5.90E-02 6.11E-02 6.07E-02 6.38E-02 6.10E-02 5.98E-02 6.11E-02 6.16E-02 6.16E-02 6.29E-02 6.08E-02 6.01E-02 75 5.90E-02 6.11E-02 6.07E-02 6.39E-02 6.10E-02 5.98E-02 6.11E-02 6.16E-02 6.16E-02 6.28E-02 6.09E-02 6.01E-02 100 5.87E-02 6.07E-02 6.05E-02 6.36E-02 6.07E-02 5.95E-02 6.09E-02 6.13E-02 6.13E-02 6.25E-02 6.08E-02 6.00E-02 200 5.75E-02 6.00E-02 5.98E-02 6.30E-02 5.98E-02 5.87E-02 6.00E-02 6.06E-02 6.07E-02 6.16E-02 6.09E-02 6.01E-02 6.16E-02 1.25E-03 6.42E-02 5.91E-02 4.00E-02 PASS 6.17E-02 1.33E-03 6.44E-02 5.89E-02 4.00E-02 PASS 6.17E-02 1.32E-03 6.44E-02 5.90E-02 4.00E-02 PASS 6.16E-02 1.31E-03 6.43E-02 5.89E-02 4.00E-02 PASS 6.15E-02 1.34E-03 6.43E-02 5.87E-02 4.00E-02 PASS 6.14E-02 1.33E-03 6.42E-02 5.87E-02 4.00E-02 PASS 6.14E-02 1.36E-03 6.42E-02 5.85E-02 4.00E-02 PASS 6.12E-02 1.38E-03 6.41E-02 5.84E-02 4.00E-02 PASS 6.13E-02 1.37E-03 6.41E-02 5.84E-02 4.00E-02 PASS 6.10E-02 1.40E-03 6.39E-02 5.81E-02 4.00E-02 PASS 6.02E-02 1.51E-03 6.33E-02 5.70E-02 4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 134 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @+/-5V #3 (A) 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.65. Plot of Maximum Output Source Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 135 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.65. Raw data for Maximum Output Source Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 5.97E-02 6.17E-02 6.11E-02 6.42E-02 6.13E-02 6.03E-02 6.16E-02 6.19E-02 6.18E-02 6.33E-02 6.10E-02 5.98E-02 10 5.97E-02 6.18E-02 6.11E-02 6.44E-02 6.12E-02 6.04E-02 6.16E-02 6.23E-02 6.19E-02 6.34E-02 6.11E-02 6.00E-02 20 5.96E-02 6.18E-02 6.12E-02 6.44E-02 6.13E-02 6.04E-02 6.16E-02 6.22E-02 6.19E-02 6.33E-02 6.12E-02 6.00E-02 30 5.95E-02 6.16E-02 6.11E-02 6.42E-02 6.12E-02 6.02E-02 6.15E-02 6.21E-02 6.17E-02 6.32E-02 6.11E-02 6.00E-02 40 5.94E-02 6.16E-02 6.11E-02 6.42E-02 6.12E-02 6.01E-02 6.15E-02 6.20E-02 6.16E-02 6.31E-02 6.11E-02 6.00E-02 50 5.94E-02 6.15E-02 6.10E-02 6.41E-02 6.11E-02 6.00E-02 6.14E-02 6.18E-02 6.16E-02 6.30E-02 6.11E-02 6.00E-02 60 5.93E-02 6.14E-02 6.08E-02 6.40E-02 6.11E-02 5.99E-02 6.12E-02 6.18E-02 6.14E-02 6.29E-02 6.11E-02 6.00E-02 70 5.91E-02 6.13E-02 6.08E-02 6.40E-02 6.10E-02 5.97E-02 6.12E-02 6.17E-02 6.14E-02 6.28E-02 6.11E-02 6.00E-02 75 5.92E-02 6.12E-02 6.07E-02 6.39E-02 6.09E-02 5.97E-02 6.12E-02 6.16E-02 6.13E-02 6.27E-02 6.11E-02 6.00E-02 100 5.88E-02 6.10E-02 6.05E-02 6.37E-02 6.07E-02 5.94E-02 6.10E-02 6.13E-02 6.11E-02 6.24E-02 6.10E-02 5.99E-02 200 5.78E-02 6.03E-02 5.98E-02 6.29E-02 6.00E-02 5.82E-02 6.01E-02 6.05E-02 6.01E-02 6.14E-02 6.11E-02 6.00E-02 6.17E-02 1.30E-03 6.44E-02 5.90E-02 4.00E-02 PASS 6.18E-02 1.37E-03 6.46E-02 5.90E-02 4.00E-02 PASS 6.18E-02 1.34E-03 6.45E-02 5.90E-02 4.00E-02 PASS 6.16E-02 1.34E-03 6.44E-02 5.89E-02 4.00E-02 PASS 6.16E-02 1.36E-03 6.44E-02 5.88E-02 4.00E-02 PASS 6.15E-02 1.36E-03 6.43E-02 5.87E-02 4.00E-02 PASS 6.14E-02 1.35E-03 6.42E-02 5.86E-02 4.00E-02 PASS 6.13E-02 1.38E-03 6.41E-02 5.84E-02 4.00E-02 PASS 6.12E-02 1.34E-03 6.40E-02 5.85E-02 4.00E-02 PASS 6.10E-02 1.39E-03 6.39E-02 5.81E-02 4.00E-02 PASS 6.01E-02 1.45E-03 6.31E-02 5.71E-02 4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 136 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @+/-5V #4 (A) 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.66. Plot of Maximum Output Source Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 137 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.66. Raw data for Maximum Output Source Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 6.06E-02 6.14E-02 6.20E-02 6.25E-02 6.32E-02 6.02E-02 6.01E-02 6.06E-02 6.10E-02 6.05E-02 6.13E-02 6.19E-02 10 6.05E-02 6.13E-02 6.21E-02 6.26E-02 6.32E-02 6.02E-02 6.02E-02 6.08E-02 6.11E-02 6.05E-02 6.15E-02 6.22E-02 20 6.05E-02 6.15E-02 6.21E-02 6.26E-02 6.33E-02 6.02E-02 6.02E-02 6.07E-02 6.10E-02 6.04E-02 6.16E-02 6.21E-02 30 6.04E-02 6.13E-02 6.21E-02 6.24E-02 6.31E-02 6.00E-02 6.01E-02 6.06E-02 6.09E-02 6.02E-02 6.16E-02 6.21E-02 40 6.02E-02 6.12E-02 6.19E-02 6.23E-02 6.30E-02 5.99E-02 6.00E-02 6.06E-02 6.08E-02 6.02E-02 6.15E-02 6.21E-02 50 6.01E-02 6.11E-02 6.18E-02 6.22E-02 6.29E-02 5.98E-02 5.99E-02 6.06E-02 6.07E-02 6.01E-02 6.15E-02 6.21E-02 60 6.00E-02 6.10E-02 6.18E-02 6.21E-02 6.29E-02 5.96E-02 5.99E-02 6.05E-02 6.06E-02 6.00E-02 6.15E-02 6.21E-02 70 5.99E-02 6.10E-02 6.17E-02 6.19E-02 6.27E-02 5.95E-02 5.97E-02 6.03E-02 6.06E-02 5.99E-02 6.14E-02 6.21E-02 75 5.99E-02 6.09E-02 6.17E-02 6.18E-02 6.27E-02 5.95E-02 5.98E-02 6.04E-02 6.05E-02 5.99E-02 6.15E-02 6.21E-02 100 5.95E-02 6.06E-02 6.14E-02 6.15E-02 6.24E-02 5.91E-02 5.95E-02 6.02E-02 6.02E-02 5.95E-02 6.15E-02 6.21E-02 200 5.84E-02 5.96E-02 6.06E-02 6.01E-02 6.16E-02 5.79E-02 5.87E-02 5.97E-02 5.93E-02 5.85E-02 6.15E-02 6.21E-02 6.12E-02 1.05E-03 6.34E-02 5.91E-02 4.00E-02 PASS 6.12E-02 1.04E-03 6.34E-02 5.91E-02 4.00E-02 PASS 6.12E-02 1.06E-03 6.34E-02 5.90E-02 4.00E-02 PASS 6.11E-02 1.08E-03 6.33E-02 5.89E-02 4.00E-02 PASS 6.10E-02 1.08E-03 6.32E-02 5.88E-02 4.00E-02 PASS 6.09E-02 1.07E-03 6.31E-02 5.87E-02 4.00E-02 PASS 6.08E-02 1.08E-03 6.31E-02 5.86E-02 4.00E-02 PASS 6.07E-02 1.07E-03 6.29E-02 5.85E-02 4.00E-02 PASS 6.07E-02 1.05E-03 6.29E-02 5.85E-02 4.00E-02 PASS 6.04E-02 1.08E-03 6.26E-02 5.82E-02 4.00E-02 PASS 5.94E-02 1.12E-03 6.17E-02 5.71E-02 4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 138 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @+/-5V #1 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.67. Plot of Maximum Output Sink Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 139 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.67. Raw data for Maximum Output Sink Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -5.12E-02 -5.18E-02 -5.28E-02 -5.35E-02 -5.41E-02 -5.07E-02 -5.02E-02 -5.10E-02 -5.15E-02 -5.10E-02 -5.17E-02 -5.20E-02 10 -5.08E-02 -5.11E-02 -5.22E-02 -5.35E-02 -5.37E-02 -5.01E-02 -4.99E-02 -5.05E-02 -5.10E-02 -5.06E-02 -5.17E-02 -5.19E-02 20 -5.06E-02 -5.08E-02 -5.19E-02 -5.35E-02 -5.35E-02 -5.00E-02 -4.96E-02 -5.01E-02 -5.06E-02 -5.02E-02 -5.17E-02 -5.20E-02 30 -5.05E-02 -5.08E-02 -5.18E-02 -5.34E-02 -5.36E-02 -5.00E-02 -4.95E-02 -5.00E-02 -5.05E-02 -5.02E-02 -5.17E-02 -5.20E-02 40 -5.05E-02 -5.08E-02 -5.18E-02 -5.31E-02 -5.37E-02 -5.00E-02 -4.95E-02 -5.00E-02 -5.05E-02 -5.01E-02 -5.17E-02 -5.21E-02 50 -5.05E-02 -5.09E-02 -5.19E-02 -5.31E-02 -5.38E-02 -5.00E-02 -4.95E-02 -5.00E-02 -5.05E-02 -5.00E-02 -5.18E-02 -5.21E-02 60 -5.04E-02 -5.08E-02 -5.19E-02 -5.29E-02 -5.38E-02 -5.00E-02 -4.94E-02 -4.99E-02 -5.04E-02 -5.00E-02 -5.18E-02 -5.21E-02 70 -5.04E-02 -5.08E-02 -5.19E-02 -5.25E-02 -5.37E-02 -4.99E-02 -4.94E-02 -4.98E-02 -5.04E-02 -4.99E-02 -5.18E-02 -5.21E-02 75 -5.04E-02 -5.07E-02 -5.18E-02 -5.26E-02 -5.37E-02 -4.99E-02 -4.93E-02 -4.98E-02 -5.02E-02 -4.98E-02 -5.18E-02 -5.21E-02 100 -5.01E-02 -5.04E-02 -5.16E-02 -5.20E-02 -5.34E-02 -4.96E-02 -4.90E-02 -4.94E-02 -4.99E-02 -4.94E-02 -5.17E-02 -5.21E-02 200 -4.93E-02 -4.90E-02 -5.02E-02 -5.05E-02 -5.23E-02 -4.85E-02 -4.78E-02 -4.81E-02 -4.83E-02 -4.78E-02 -5.18E-02 -5.21E-02 -5.18E-02 1.28E-03 -4.91E-02 -5.44E-02 -4.00E-02 PASS -5.13E-02 1.35E-03 -4.86E-02 -5.41E-02 -4.00E-02 PASS -5.11E-02 1.42E-03 -4.82E-02 -5.40E-02 -4.00E-02 PASS -5.10E-02 1.44E-03 -4.81E-02 -5.40E-02 -4.00E-02 PASS -5.10E-02 1.42E-03 -4.81E-02 -5.39E-02 -4.00E-02 PASS -5.10E-02 1.46E-03 -4.80E-02 -5.40E-02 -4.00E-02 PASS -5.09E-02 1.45E-03 -4.80E-02 -5.39E-02 -4.00E-02 PASS -5.09E-02 1.41E-03 -4.80E-02 -5.38E-02 -4.00E-02 PASS -5.08E-02 1.43E-03 -4.79E-02 -5.38E-02 -4.00E-02 PASS -5.05E-02 1.40E-03 -4.76E-02 -5.34E-02 -4.00E-02 PASS -4.92E-02 1.44E-03 -4.62E-02 -5.22E-02 -4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 140 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @+/-5V #2 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.68. Plot of Maximum Output Sink Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 141 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.68. Raw data for Maximum Output Sink Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -4.98E-02 -5.11E-02 -5.16E-02 -5.47E-02 -5.19E-02 -5.06E-02 -5.19E-02 -5.27E-02 -5.10E-02 -5.42E-02 -5.08E-02 -5.00E-02 10 -4.93E-02 -5.07E-02 -5.11E-02 -5.46E-02 -5.16E-02 -5.02E-02 -5.15E-02 -5.22E-02 -5.10E-02 -5.40E-02 -5.07E-02 -4.99E-02 20 -4.91E-02 -5.07E-02 -5.09E-02 -5.46E-02 -5.14E-02 -5.00E-02 -5.12E-02 -5.19E-02 -5.09E-02 -5.39E-02 -5.07E-02 -5.00E-02 30 -4.90E-02 -5.10E-02 -5.07E-02 -5.45E-02 -5.11E-02 -4.97E-02 -5.11E-02 -5.18E-02 -5.12E-02 -5.37E-02 -5.07E-02 -5.00E-02 40 -4.90E-02 -5.11E-02 -5.07E-02 -5.43E-02 -5.11E-02 -4.96E-02 -5.11E-02 -5.19E-02 -5.12E-02 -5.38E-02 -5.08E-02 -5.00E-02 50 -4.90E-02 -5.12E-02 -5.07E-02 -5.42E-02 -5.11E-02 -4.98E-02 -5.12E-02 -5.19E-02 -5.14E-02 -5.38E-02 -5.09E-02 -5.00E-02 60 -4.90E-02 -5.12E-02 -5.07E-02 -5.40E-02 -5.10E-02 -4.96E-02 -5.12E-02 -5.19E-02 -5.14E-02 -5.39E-02 -5.08E-02 -5.00E-02 70 -4.90E-02 -5.11E-02 -5.06E-02 -5.39E-02 -5.09E-02 -4.95E-02 -5.11E-02 -5.19E-02 -5.13E-02 -5.39E-02 -5.08E-02 -5.00E-02 75 -4.89E-02 -5.11E-02 -5.06E-02 -5.38E-02 -5.09E-02 -4.94E-02 -5.11E-02 -5.19E-02 -5.13E-02 -5.39E-02 -5.09E-02 -5.00E-02 100 -4.87E-02 -5.08E-02 -5.04E-02 -5.31E-02 -5.05E-02 -4.91E-02 -5.08E-02 -5.16E-02 -5.11E-02 -5.36E-02 -5.08E-02 -5.00E-02 200 -4.77E-02 -4.94E-02 -4.90E-02 -5.16E-02 -4.92E-02 -4.76E-02 -4.95E-02 -5.04E-02 -4.97E-02 -5.28E-02 -5.08E-02 -5.00E-02 -5.19E-02 1.56E-03 -4.87E-02 -5.52E-02 -4.00E-02 PASS -5.16E-02 1.62E-03 -4.83E-02 -5.50E-02 -4.00E-02 PASS -5.15E-02 1.65E-03 -4.80E-02 -5.49E-02 -4.00E-02 PASS -5.14E-02 1.64E-03 -4.80E-02 -5.48E-02 -4.00E-02 PASS -5.14E-02 1.62E-03 -4.80E-02 -5.47E-02 -4.00E-02 PASS -5.14E-02 1.60E-03 -4.81E-02 -5.47E-02 -4.00E-02 PASS -5.14E-02 1.59E-03 -4.81E-02 -5.47E-02 -4.00E-02 PASS -5.13E-02 1.59E-03 -4.80E-02 -5.46E-02 -4.00E-02 PASS -5.13E-02 1.60E-03 -4.80E-02 -5.46E-02 -4.00E-02 PASS -5.10E-02 1.56E-03 -4.78E-02 -5.42E-02 -4.00E-02 PASS -4.97E-02 1.60E-03 -4.64E-02 -5.30E-02 -4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 142 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @+/-5V #3 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.69. Plot of Maximum Output Sink Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 143 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.69. Raw data for Maximum Output Sink Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -4.96E-02 -5.23E-02 -5.16E-02 -5.53E-02 -5.20E-02 -5.10E-02 -5.20E-02 -5.29E-02 -5.25E-02 -5.45E-02 -5.17E-02 -5.04E-02 10 -4.90E-02 -5.17E-02 -5.10E-02 -5.53E-02 -5.16E-02 -5.06E-02 -5.15E-02 -5.24E-02 -5.19E-02 -5.41E-02 -5.16E-02 -5.03E-02 20 -4.89E-02 -5.15E-02 -5.08E-02 -5.52E-02 -5.13E-02 -5.05E-02 -5.12E-02 -5.22E-02 -5.17E-02 -5.39E-02 -5.16E-02 -5.04E-02 30 -4.90E-02 -5.14E-02 -5.06E-02 -5.51E-02 -5.12E-02 -5.02E-02 -5.11E-02 -5.20E-02 -5.17E-02 -5.39E-02 -5.16E-02 -5.04E-02 40 -4.91E-02 -5.14E-02 -5.07E-02 -5.50E-02 -5.12E-02 -5.02E-02 -5.10E-02 -5.21E-02 -5.17E-02 -5.40E-02 -5.17E-02 -5.04E-02 50 -4.92E-02 -5.15E-02 -5.07E-02 -5.49E-02 -5.12E-02 -5.02E-02 -5.11E-02 -5.22E-02 -5.18E-02 -5.41E-02 -5.17E-02 -5.05E-02 60 -4.91E-02 -5.15E-02 -5.07E-02 -5.46E-02 -5.11E-02 -5.02E-02 -5.11E-02 -5.22E-02 -5.18E-02 -5.41E-02 -5.17E-02 -5.05E-02 70 -4.90E-02 -5.13E-02 -5.05E-02 -5.45E-02 -5.09E-02 -5.02E-02 -5.11E-02 -5.22E-02 -5.17E-02 -5.41E-02 -5.17E-02 -5.05E-02 75 -4.90E-02 -5.13E-02 -5.05E-02 -5.44E-02 -5.09E-02 -5.01E-02 -5.11E-02 -5.22E-02 -5.17E-02 -5.41E-02 -5.17E-02 -5.05E-02 100 -4.87E-02 -5.10E-02 -5.01E-02 -5.38E-02 -5.06E-02 -4.99E-02 -5.08E-02 -5.21E-02 -5.14E-02 -5.39E-02 -5.17E-02 -5.05E-02 200 -4.76E-02 -4.98E-02 -4.87E-02 -5.22E-02 -4.92E-02 -4.89E-02 -4.95E-02 -5.13E-02 -5.05E-02 -5.30E-02 -5.17E-02 -5.05E-02 -5.24E-02 1.63E-03 -4.90E-02 -5.57E-02 -4.00E-02 PASS -5.19E-02 1.76E-03 -4.83E-02 -5.56E-02 -4.00E-02 PASS -5.17E-02 1.76E-03 -4.81E-02 -5.54E-02 -4.00E-02 PASS -5.16E-02 1.75E-03 -4.80E-02 -5.52E-02 -4.00E-02 PASS -5.16E-02 1.71E-03 -4.81E-02 -5.52E-02 -4.00E-02 PASS -5.17E-02 1.71E-03 -4.82E-02 -5.52E-02 -4.00E-02 PASS -5.16E-02 1.66E-03 -4.82E-02 -5.51E-02 -4.00E-02 PASS -5.15E-02 1.69E-03 -4.81E-02 -5.50E-02 -4.00E-02 PASS -5.15E-02 1.67E-03 -4.81E-02 -5.50E-02 -4.00E-02 PASS -5.12E-02 1.65E-03 -4.78E-02 -5.46E-02 -4.00E-02 PASS -5.01E-02 1.68E-03 -4.66E-02 -5.35E-02 -4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 144 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @+/-5V #4 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.70. Plot of Maximum Output Sink Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 145 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.70. Raw data for Maximum Output Sink Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -5.11E-02 -5.18E-02 -5.29E-02 -5.33E-02 -5.39E-02 -5.06E-02 -5.01E-02 -5.08E-02 -5.12E-02 -5.10E-02 -5.19E-02 -5.17E-02 10 -5.07E-02 -5.12E-02 -5.26E-02 -5.32E-02 -5.34E-02 -5.00E-02 -4.96E-02 -5.03E-02 -5.08E-02 -5.05E-02 -5.19E-02 -5.17E-02 20 -5.05E-02 -5.11E-02 -5.22E-02 -5.31E-02 -5.34E-02 -4.99E-02 -4.94E-02 -5.00E-02 -5.05E-02 -5.02E-02 -5.19E-02 -5.17E-02 30 -5.04E-02 -5.10E-02 -5.22E-02 -5.30E-02 -5.31E-02 -4.97E-02 -4.93E-02 -4.97E-02 -5.04E-02 -5.00E-02 -5.19E-02 -5.17E-02 40 -5.03E-02 -5.11E-02 -5.22E-02 -5.29E-02 -5.31E-02 -4.97E-02 -4.93E-02 -4.97E-02 -5.04E-02 -5.01E-02 -5.20E-02 -5.17E-02 50 -5.04E-02 -5.11E-02 -5.23E-02 -5.28E-02 -5.32E-02 -4.98E-02 -4.93E-02 -4.98E-02 -5.04E-02 -5.00E-02 -5.21E-02 -5.18E-02 60 -5.03E-02 -5.11E-02 -5.23E-02 -5.27E-02 -5.31E-02 -4.96E-02 -4.93E-02 -4.96E-02 -5.04E-02 -4.99E-02 -5.21E-02 -5.18E-02 70 -5.02E-02 -5.10E-02 -5.23E-02 -5.24E-02 -5.30E-02 -4.96E-02 -4.91E-02 -4.96E-02 -5.02E-02 -4.99E-02 -5.20E-02 -5.18E-02 75 -5.02E-02 -5.10E-02 -5.23E-02 -5.23E-02 -5.30E-02 -4.96E-02 -4.91E-02 -4.95E-02 -5.02E-02 -4.98E-02 -5.21E-02 -5.18E-02 100 -5.00E-02 -5.07E-02 -5.21E-02 -5.18E-02 -5.27E-02 -4.93E-02 -4.88E-02 -4.91E-02 -5.00E-02 -4.94E-02 -5.21E-02 -5.17E-02 200 -4.89E-02 -4.97E-02 -5.11E-02 -5.06E-02 -5.13E-02 -4.82E-02 -4.75E-02 -4.75E-02 -4.85E-02 -4.78E-02 -5.21E-02 -5.18E-02 -5.17E-02 1.27E-03 -4.90E-02 -5.43E-02 -4.00E-02 PASS -5.12E-02 1.33E-03 -4.85E-02 -5.40E-02 -4.00E-02 PASS -5.10E-02 1.40E-03 -4.81E-02 -5.39E-02 -4.00E-02 PASS -5.09E-02 1.40E-03 -4.80E-02 -5.38E-02 -4.00E-02 PASS -5.09E-02 1.39E-03 -4.80E-02 -5.37E-02 -4.00E-02 PASS -5.09E-02 1.39E-03 -4.80E-02 -5.38E-02 -4.00E-02 PASS -5.08E-02 1.39E-03 -4.80E-02 -5.37E-02 -4.00E-02 PASS -5.07E-02 1.37E-03 -4.79E-02 -5.36E-02 -4.00E-02 PASS -5.07E-02 1.37E-03 -4.79E-02 -5.35E-02 -4.00E-02 PASS -5.04E-02 1.36E-03 -4.76E-02 -5.32E-02 -4.00E-02 PASS -4.91E-02 1.48E-03 -4.60E-02 -5.22E-02 -4.00E-02 PASS An ISO 9001:2008 and DSCC Certified Company 146 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @+/-5V #1 (A) 9.00E-02 8.80E-02 8.60E-02 8.40E-02 8.20E-02 8.00E-02 7.80E-02 7.60E-02 7.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.71. Plot of Positive Short-Circuit Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 147 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.71. Raw data for Positive Short-Circuit Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.68E-02 8.71E-02 8.70E-02 8.75E-02 8.74E-02 8.62E-02 8.63E-02 8.63E-02 8.65E-02 8.59E-02 8.63E-02 8.63E-02 10 8.66E-02 8.70E-02 8.70E-02 8.75E-02 8.73E-02 8.61E-02 8.63E-02 8.64E-02 8.66E-02 8.59E-02 8.63E-02 8.64E-02 20 8.62E-02 8.67E-02 8.67E-02 8.72E-02 8.70E-02 8.59E-02 8.61E-02 8.62E-02 8.64E-02 8.58E-02 8.61E-02 8.62E-02 30 8.61E-02 8.65E-02 8.65E-02 8.70E-02 8.69E-02 8.58E-02 8.61E-02 8.61E-02 8.63E-02 8.57E-02 8.60E-02 8.61E-02 40 8.60E-02 8.66E-02 8.65E-02 8.70E-02 8.69E-02 8.58E-02 8.60E-02 8.61E-02 8.63E-02 8.57E-02 8.59E-02 8.59E-02 50 8.60E-02 8.66E-02 8.66E-02 8.71E-02 8.69E-02 8.58E-02 8.60E-02 8.61E-02 8.63E-02 8.57E-02 8.58E-02 8.59E-02 60 8.59E-02 8.65E-02 8.65E-02 8.70E-02 8.69E-02 8.58E-02 8.61E-02 8.61E-02 8.63E-02 8.57E-02 8.58E-02 8.58E-02 70 8.60E-02 8.65E-02 8.65E-02 8.71E-02 8.69E-02 8.58E-02 8.60E-02 8.61E-02 8.63E-02 8.57E-02 8.58E-02 8.58E-02 75 8.61E-02 8.66E-02 8.66E-02 8.72E-02 8.69E-02 8.58E-02 8.61E-02 8.61E-02 8.63E-02 8.57E-02 8.57E-02 8.58E-02 100 8.63E-02 8.68E-02 8.67E-02 8.74E-02 8.72E-02 8.61E-02 8.62E-02 8.63E-02 8.66E-02 8.59E-02 8.58E-02 8.58E-02 200 8.73E-02 8.77E-02 8.76E-02 8.84E-02 8.80E-02 8.70E-02 8.71E-02 8.72E-02 8.74E-02 8.69E-02 8.58E-02 8.59E-02 8.67E-02 5.56E-04 8.79E-02 8.56E-02 7.50E-02 PASS 8.67E-02 5.16E-04 8.78E-02 8.56E-02 7.50E-02 PASS 8.64E-02 4.74E-04 8.74E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.44E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.55E-04 8.72E-02 8.53E-02 7.50E-02 PASS 8.63E-02 4.70E-04 8.73E-02 8.53E-02 7.50E-02 PASS 8.63E-02 4.54E-04 8.72E-02 8.53E-02 7.50E-02 PASS 8.63E-02 4.61E-04 8.73E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.70E-04 8.73E-02 8.54E-02 7.50E-02 PASS 8.66E-02 4.74E-04 8.75E-02 8.56E-02 7.50E-02 PASS 8.75E-02 4.69E-04 8.84E-02 8.65E-02 7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 148 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @+/-5V #2 (A) 9.00E-02 8.80E-02 8.60E-02 8.40E-02 8.20E-02 8.00E-02 7.80E-02 7.60E-02 7.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.72. Plot of Positive Short-Circuit Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 149 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.72. Raw data for Positive Short-Circuit Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.67E-02 8.72E-02 8.68E-02 8.78E-02 8.67E-02 8.62E-02 8.67E-02 8.67E-02 8.67E-02 8.68E-02 8.61E-02 8.58E-02 10 8.66E-02 8.72E-02 8.68E-02 8.77E-02 8.66E-02 8.62E-02 8.67E-02 8.68E-02 8.67E-02 8.69E-02 8.60E-02 8.59E-02 20 8.62E-02 8.68E-02 8.64E-02 8.74E-02 8.63E-02 8.59E-02 8.64E-02 8.66E-02 8.66E-02 8.67E-02 8.58E-02 8.56E-02 30 8.60E-02 8.67E-02 8.63E-02 8.73E-02 8.62E-02 8.58E-02 8.63E-02 8.65E-02 8.64E-02 8.66E-02 8.57E-02 8.55E-02 40 8.59E-02 8.66E-02 8.63E-02 8.73E-02 8.62E-02 8.58E-02 8.63E-02 8.64E-02 8.64E-02 8.66E-02 8.57E-02 8.54E-02 50 8.60E-02 8.66E-02 8.63E-02 8.74E-02 8.62E-02 8.58E-02 8.63E-02 8.64E-02 8.64E-02 8.66E-02 8.56E-02 8.54E-02 60 8.59E-02 8.66E-02 8.63E-02 8.74E-02 8.62E-02 8.58E-02 8.64E-02 8.65E-02 8.64E-02 8.66E-02 8.56E-02 8.53E-02 70 8.59E-02 8.67E-02 8.63E-02 8.74E-02 8.62E-02 8.59E-02 8.64E-02 8.65E-02 8.64E-02 8.67E-02 8.55E-02 8.53E-02 75 8.60E-02 8.67E-02 8.63E-02 8.75E-02 8.62E-02 8.58E-02 8.64E-02 8.65E-02 8.64E-02 8.67E-02 8.55E-02 8.53E-02 100 8.62E-02 8.69E-02 8.66E-02 8.78E-02 8.64E-02 8.61E-02 8.66E-02 8.67E-02 8.67E-02 8.68E-02 8.56E-02 8.53E-02 200 8.72E-02 8.78E-02 8.74E-02 8.87E-02 8.73E-02 8.70E-02 8.75E-02 8.75E-02 8.75E-02 8.76E-02 8.56E-02 8.53E-02 8.68E-02 4.19E-04 8.77E-02 8.59E-02 7.50E-02 PASS 8.68E-02 4.12E-04 8.77E-02 8.60E-02 7.50E-02 PASS 8.65E-02 3.98E-04 8.73E-02 8.57E-02 7.50E-02 PASS 8.64E-02 4.06E-04 8.72E-02 8.56E-02 7.50E-02 PASS 8.64E-02 3.98E-04 8.72E-02 8.56E-02 7.50E-02 PASS 8.64E-02 4.18E-04 8.73E-02 8.55E-02 7.50E-02 PASS 8.64E-02 4.29E-04 8.73E-02 8.55E-02 7.50E-02 PASS 8.64E-02 4.37E-04 8.73E-02 8.55E-02 7.50E-02 PASS 8.65E-02 4.62E-04 8.74E-02 8.55E-02 7.50E-02 PASS 8.67E-02 4.68E-04 8.76E-02 8.57E-02 7.50E-02 PASS 8.76E-02 4.66E-04 8.85E-02 8.66E-02 7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 150 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @+/-5V #3 (A) 9.00E-02 8.80E-02 8.60E-02 8.40E-02 8.20E-02 8.00E-02 7.80E-02 7.60E-02 7.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.73. Plot of Positive Short-Circuit Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 151 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.73. Raw data for Positive Short-Circuit Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.66E-02 8.71E-02 8.68E-02 8.76E-02 8.64E-02 8.60E-02 8.68E-02 8.67E-02 8.65E-02 8.67E-02 8.61E-02 8.56E-02 10 8.64E-02 8.71E-02 8.68E-02 8.77E-02 8.64E-02 8.60E-02 8.68E-02 8.68E-02 8.66E-02 8.67E-02 8.60E-02 8.57E-02 20 8.60E-02 8.68E-02 8.64E-02 8.73E-02 8.61E-02 8.57E-02 8.66E-02 8.66E-02 8.64E-02 8.66E-02 8.58E-02 8.55E-02 30 8.58E-02 8.66E-02 8.63E-02 8.71E-02 8.61E-02 8.56E-02 8.64E-02 8.65E-02 8.63E-02 8.64E-02 8.58E-02 8.53E-02 40 8.58E-02 8.66E-02 8.63E-02 8.72E-02 8.61E-02 8.56E-02 8.64E-02 8.64E-02 8.63E-02 8.64E-02 8.57E-02 8.52E-02 50 8.58E-02 8.66E-02 8.63E-02 8.72E-02 8.61E-02 8.56E-02 8.64E-02 8.65E-02 8.63E-02 8.64E-02 8.56E-02 8.52E-02 60 8.58E-02 8.65E-02 8.63E-02 8.72E-02 8.61E-02 8.56E-02 8.64E-02 8.65E-02 8.63E-02 8.64E-02 8.56E-02 8.52E-02 70 8.58E-02 8.65E-02 8.63E-02 8.73E-02 8.60E-02 8.57E-02 8.65E-02 8.65E-02 8.63E-02 8.65E-02 8.55E-02 8.51E-02 75 8.58E-02 8.66E-02 8.63E-02 8.73E-02 8.61E-02 8.57E-02 8.64E-02 8.66E-02 8.63E-02 8.64E-02 8.55E-02 8.51E-02 100 8.61E-02 8.68E-02 8.66E-02 8.75E-02 8.63E-02 8.58E-02 8.67E-02 8.67E-02 8.66E-02 8.67E-02 8.56E-02 8.52E-02 200 8.70E-02 8.78E-02 8.74E-02 8.85E-02 8.72E-02 8.68E-02 8.75E-02 8.75E-02 8.74E-02 8.75E-02 8.56E-02 8.52E-02 8.67E-02 4.32E-04 8.76E-02 8.58E-02 7.50E-02 PASS 8.67E-02 4.48E-04 8.76E-02 8.58E-02 7.50E-02 PASS 8.64E-02 4.39E-04 8.73E-02 8.55E-02 7.50E-02 PASS 8.63E-02 4.25E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.28E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.36E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.45E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.43E-04 8.73E-02 8.54E-02 7.50E-02 PASS 8.64E-02 4.40E-04 8.73E-02 8.54E-02 7.50E-02 PASS 8.66E-02 4.61E-04 8.75E-02 8.56E-02 7.50E-02 PASS 8.75E-02 4.57E-04 8.84E-02 8.65E-02 7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 152 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @+/-5V #4 (A) 9.00E-02 8.80E-02 8.60E-02 8.40E-02 8.20E-02 8.00E-02 7.80E-02 7.60E-02 7.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.74. Plot of Positive Short-Circuit Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 153 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.74. Raw data for Positive Short-Circuit Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.68E-02 8.70E-02 8.70E-02 8.74E-02 8.73E-02 8.62E-02 8.64E-02 8.62E-02 8.64E-02 8.59E-02 8.63E-02 8.62E-02 10 8.66E-02 8.70E-02 8.70E-02 8.74E-02 8.73E-02 8.62E-02 8.64E-02 8.63E-02 8.65E-02 8.59E-02 8.63E-02 8.63E-02 20 8.62E-02 8.67E-02 8.67E-02 8.71E-02 8.69E-02 8.59E-02 8.62E-02 8.61E-02 8.63E-02 8.58E-02 8.61E-02 8.61E-02 30 8.61E-02 8.65E-02 8.65E-02 8.70E-02 8.69E-02 8.58E-02 8.61E-02 8.61E-02 8.62E-02 8.57E-02 8.61E-02 8.59E-02 40 8.60E-02 8.64E-02 8.65E-02 8.70E-02 8.68E-02 8.58E-02 8.61E-02 8.60E-02 8.62E-02 8.57E-02 8.59E-02 8.58E-02 50 8.60E-02 8.64E-02 8.65E-02 8.70E-02 8.68E-02 8.58E-02 8.61E-02 8.60E-02 8.62E-02 8.57E-02 8.58E-02 8.58E-02 60 8.60E-02 8.64E-02 8.65E-02 8.70E-02 8.68E-02 8.58E-02 8.61E-02 8.61E-02 8.62E-02 8.57E-02 8.58E-02 8.58E-02 70 8.60E-02 8.65E-02 8.65E-02 8.71E-02 8.69E-02 8.58E-02 8.61E-02 8.60E-02 8.62E-02 8.57E-02 8.58E-02 8.57E-02 75 8.61E-02 8.66E-02 8.65E-02 8.71E-02 8.69E-02 8.58E-02 8.61E-02 8.61E-02 8.62E-02 8.57E-02 8.57E-02 8.57E-02 100 8.63E-02 8.68E-02 8.68E-02 8.74E-02 8.70E-02 8.61E-02 8.63E-02 8.63E-02 8.64E-02 8.59E-02 8.58E-02 8.57E-02 200 8.72E-02 8.77E-02 8.76E-02 8.83E-02 8.80E-02 8.70E-02 8.72E-02 8.71E-02 8.73E-02 8.68E-02 8.58E-02 8.58E-02 8.67E-02 5.16E-04 8.77E-02 8.56E-02 7.50E-02 PASS 8.67E-02 4.99E-04 8.77E-02 8.57E-02 7.50E-02 PASS 8.64E-02 4.46E-04 8.73E-02 8.55E-02 7.50E-02 PASS 8.63E-02 4.47E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.62E-02 4.25E-04 8.71E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.29E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.26E-04 8.71E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.54E-04 8.72E-02 8.54E-02 7.50E-02 PASS 8.63E-02 4.58E-04 8.73E-02 8.54E-02 7.50E-02 PASS 8.65E-02 4.58E-04 8.75E-02 8.56E-02 7.50E-02 PASS 8.74E-02 4.85E-04 8.84E-02 8.64E-02 7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 154 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @+/-5V #1 (A) -7.40E-02 -7.50E-02 -7.60E-02 -7.70E-02 -7.80E-02 -7.90E-02 -8.00E-02 -8.10E-02 -8.20E-02 -8.30E-02 -8.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.75. Plot of Negative Short-Circuit Current @+/-5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 155 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.75. Raw data for Negative Short-Circuit Current @+/-5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @+/-5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -8.18E-02 -8.22E-02 -8.23E-02 -8.27E-02 -8.25E-02 -8.13E-02 -8.14E-02 -8.13E-02 -8.18E-02 -8.10E-02 -8.15E-02 -8.13E-02 10 -8.17E-02 -8.21E-02 -8.23E-02 -8.26E-02 -8.25E-02 -8.13E-02 -8.15E-02 -8.14E-02 -8.19E-02 -8.12E-02 -8.15E-02 -8.14E-02 20 -8.13E-02 -8.18E-02 -8.19E-02 -8.24E-02 -8.21E-02 -8.11E-02 -8.12E-02 -8.12E-02 -8.17E-02 -8.09E-02 -8.14E-02 -8.12E-02 30 -8.12E-02 -8.16E-02 -8.19E-02 -8.23E-02 -8.20E-02 -8.09E-02 -8.11E-02 -8.11E-02 -8.16E-02 -8.09E-02 -8.12E-02 -8.10E-02 40 -8.11E-02 -8.17E-02 -8.18E-02 -8.23E-02 -8.20E-02 -8.09E-02 -8.10E-02 -8.10E-02 -8.15E-02 -8.09E-02 -8.11E-02 -8.09E-02 50 -8.11E-02 -8.17E-02 -8.18E-02 -8.23E-02 -8.20E-02 -8.09E-02 -8.11E-02 -8.11E-02 -8.16E-02 -8.09E-02 -8.11E-02 -8.09E-02 60 -8.11E-02 -8.16E-02 -8.18E-02 -8.22E-02 -8.20E-02 -8.09E-02 -8.12E-02 -8.12E-02 -8.16E-02 -8.09E-02 -8.10E-02 -8.08E-02 70 -8.11E-02 -8.18E-02 -8.19E-02 -8.24E-02 -8.21E-02 -8.10E-02 -8.11E-02 -8.11E-02 -8.16E-02 -8.10E-02 -8.09E-02 -8.08E-02 75 -8.12E-02 -8.18E-02 -8.18E-02 -8.24E-02 -8.22E-02 -8.10E-02 -8.12E-02 -8.12E-02 -8.17E-02 -8.10E-02 -8.09E-02 -8.08E-02 100 -8.14E-02 -8.20E-02 -8.21E-02 -8.27E-02 -8.23E-02 -8.13E-02 -8.13E-02 -8.13E-02 -8.19E-02 -8.12E-02 -8.10E-02 -8.08E-02 200 -8.25E-02 -8.30E-02 -8.31E-02 -8.38E-02 -8.33E-02 -8.23E-02 -8.24E-02 -8.23E-02 -8.29E-02 -8.22E-02 -8.10E-02 -8.09E-02 -8.18E-02 5.75E-04 -8.06E-02 -8.30E-02 -7.50E-02 PASS -8.18E-02 5.28E-04 -8.07E-02 -8.29E-02 -7.50E-02 PASS -8.16E-02 4.89E-04 -8.05E-02 -8.26E-02 -7.50E-02 PASS -8.15E-02 4.79E-04 -8.05E-02 -8.25E-02 -7.50E-02 PASS -8.14E-02 4.90E-04 -8.04E-02 -8.24E-02 -7.50E-02 PASS -8.15E-02 4.79E-04 -8.05E-02 -8.24E-02 -7.50E-02 PASS -8.15E-02 4.74E-04 -8.05E-02 -8.24E-02 -7.50E-02 PASS -8.15E-02 4.98E-04 -8.05E-02 -8.25E-02 -7.50E-02 PASS -8.15E-02 4.96E-04 -8.05E-02 -8.26E-02 -7.50E-02 PASS -8.18E-02 5.24E-04 -8.07E-02 -8.28E-02 -7.50E-02 PASS -8.28E-02 5.30E-04 -8.17E-02 -8.39E-02 -7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 156 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @+/-5V #2 (A) -7.40E-02 -7.50E-02 -7.60E-02 -7.70E-02 -7.80E-02 -7.90E-02 -8.00E-02 -8.10E-02 -8.20E-02 -8.30E-02 -8.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.76. Plot of Negative Short-Circuit Current @+/-5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 157 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.76. Raw data for Negative Short-Circuit Current @+/-5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @+/-5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -8.17E-02 -8.25E-02 -8.19E-02 -8.29E-02 -8.18E-02 -8.13E-02 -8.20E-02 -8.19E-02 -8.19E-02 -8.21E-02 -8.13E-02 -8.09E-02 10 -8.15E-02 -8.24E-02 -8.19E-02 -8.29E-02 -8.18E-02 -8.12E-02 -8.20E-02 -8.20E-02 -8.20E-02 -8.22E-02 -8.13E-02 -8.10E-02 20 -8.12E-02 -8.20E-02 -8.15E-02 -8.26E-02 -8.14E-02 -8.10E-02 -8.18E-02 -8.18E-02 -8.18E-02 -8.20E-02 -8.11E-02 -8.07E-02 30 -8.10E-02 -8.19E-02 -8.14E-02 -8.25E-02 -8.14E-02 -8.09E-02 -8.17E-02 -8.18E-02 -8.18E-02 -8.20E-02 -8.10E-02 -8.06E-02 40 -8.10E-02 -8.19E-02 -8.14E-02 -8.25E-02 -8.13E-02 -8.08E-02 -8.17E-02 -8.18E-02 -8.17E-02 -8.19E-02 -8.09E-02 -8.05E-02 50 -8.10E-02 -8.19E-02 -8.14E-02 -8.25E-02 -8.14E-02 -8.09E-02 -8.17E-02 -8.18E-02 -8.18E-02 -8.20E-02 -8.08E-02 -8.05E-02 60 -8.10E-02 -8.19E-02 -8.14E-02 -8.26E-02 -8.14E-02 -8.09E-02 -8.18E-02 -8.18E-02 -8.18E-02 -8.20E-02 -8.08E-02 -8.04E-02 70 -8.10E-02 -8.19E-02 -8.15E-02 -8.26E-02 -8.14E-02 -8.09E-02 -8.18E-02 -8.18E-02 -8.18E-02 -8.20E-02 -8.07E-02 -8.04E-02 75 -8.11E-02 -8.19E-02 -8.14E-02 -8.26E-02 -8.14E-02 -8.09E-02 -8.18E-02 -8.18E-02 -8.18E-02 -8.20E-02 -8.07E-02 -8.03E-02 100 -8.13E-02 -8.21E-02 -8.17E-02 -8.30E-02 -8.16E-02 -8.12E-02 -8.20E-02 -8.20E-02 -8.20E-02 -8.23E-02 -8.08E-02 -8.04E-02 200 -8.23E-02 -8.32E-02 -8.27E-02 -8.40E-02 -8.26E-02 -8.21E-02 -8.31E-02 -8.30E-02 -8.30E-02 -8.32E-02 -8.08E-02 -8.04E-02 -8.20E-02 4.47E-04 -8.11E-02 -8.29E-02 -7.50E-02 PASS -8.20E-02 4.53E-04 -8.11E-02 -8.29E-02 -7.50E-02 PASS -8.17E-02 4.73E-04 -8.07E-02 -8.27E-02 -7.50E-02 PASS -8.16E-02 4.62E-04 -8.07E-02 -8.26E-02 -7.50E-02 PASS -8.16E-02 4.91E-04 -8.06E-02 -8.26E-02 -7.50E-02 PASS -8.16E-02 4.78E-04 -8.06E-02 -8.26E-02 -7.50E-02 PASS -8.16E-02 4.90E-04 -8.06E-02 -8.27E-02 -7.50E-02 PASS -8.17E-02 4.92E-04 -8.06E-02 -8.27E-02 -7.50E-02 PASS -8.17E-02 4.94E-04 -8.07E-02 -8.27E-02 -7.50E-02 PASS -8.19E-02 5.21E-04 -8.08E-02 -8.30E-02 -7.50E-02 PASS -8.29E-02 5.20E-04 -8.19E-02 -8.40E-02 -7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 158 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @+/-5V #3 (A) -7.40E-02 -7.50E-02 -7.60E-02 -7.70E-02 -7.80E-02 -7.90E-02 -8.00E-02 -8.10E-02 -8.20E-02 -8.30E-02 -8.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.77. Plot of Negative Short-Circuit Current @+/-5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 159 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.77. Raw data for Negative Short-Circuit Current @+/-5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @+/-5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -8.15E-02 -8.22E-02 -8.19E-02 -8.29E-02 -8.15E-02 -8.11E-02 -8.20E-02 -8.19E-02 -8.18E-02 -8.20E-02 -8.13E-02 -8.08E-02 10 -8.14E-02 -8.22E-02 -8.19E-02 -8.29E-02 -8.15E-02 -8.11E-02 -8.21E-02 -8.20E-02 -8.18E-02 -8.20E-02 -8.14E-02 -8.08E-02 20 -8.11E-02 -8.19E-02 -8.16E-02 -8.25E-02 -8.12E-02 -8.08E-02 -8.19E-02 -8.18E-02 -8.16E-02 -8.19E-02 -8.12E-02 -8.06E-02 30 -8.09E-02 -8.18E-02 -8.15E-02 -8.24E-02 -8.11E-02 -8.08E-02 -8.18E-02 -8.18E-02 -8.15E-02 -8.18E-02 -8.10E-02 -8.05E-02 40 -8.08E-02 -8.17E-02 -8.14E-02 -8.24E-02 -8.10E-02 -8.07E-02 -8.18E-02 -8.17E-02 -8.15E-02 -8.18E-02 -8.09E-02 -8.04E-02 50 -8.08E-02 -8.17E-02 -8.14E-02 -8.25E-02 -8.11E-02 -8.07E-02 -8.18E-02 -8.17E-02 -8.15E-02 -8.18E-02 -8.09E-02 -8.03E-02 60 -8.08E-02 -8.18E-02 -8.14E-02 -8.25E-02 -8.12E-02 -8.08E-02 -8.18E-02 -8.18E-02 -8.15E-02 -8.18E-02 -8.08E-02 -8.03E-02 70 -8.09E-02 -8.17E-02 -8.15E-02 -8.25E-02 -8.11E-02 -8.08E-02 -8.19E-02 -8.18E-02 -8.15E-02 -8.19E-02 -8.08E-02 -8.03E-02 75 -8.09E-02 -8.18E-02 -8.15E-02 -8.26E-02 -8.12E-02 -8.08E-02 -8.19E-02 -8.18E-02 -8.15E-02 -8.19E-02 -8.07E-02 -8.02E-02 100 -8.12E-02 -8.20E-02 -8.18E-02 -8.29E-02 -8.14E-02 -8.10E-02 -8.20E-02 -8.20E-02 -8.18E-02 -8.21E-02 -8.08E-02 -8.03E-02 200 -8.21E-02 -8.31E-02 -8.27E-02 -8.39E-02 -8.24E-02 -8.20E-02 -8.31E-02 -8.29E-02 -8.27E-02 -8.31E-02 -8.09E-02 -8.03E-02 -8.19E-02 4.64E-04 -8.09E-02 -8.28E-02 -7.50E-02 PASS -8.19E-02 4.93E-04 -8.09E-02 -8.29E-02 -7.50E-02 PASS -8.16E-02 4.95E-04 -8.06E-02 -8.26E-02 -7.50E-02 PASS -8.15E-02 4.72E-04 -8.06E-02 -8.25E-02 -7.50E-02 PASS -8.15E-02 5.14E-04 -8.04E-02 -8.25E-02 -7.50E-02 PASS -8.15E-02 5.27E-04 -8.04E-02 -8.26E-02 -7.50E-02 PASS -8.15E-02 5.08E-04 -8.05E-02 -8.26E-02 -7.50E-02 PASS -8.16E-02 5.09E-04 -8.05E-02 -8.26E-02 -7.50E-02 PASS -8.16E-02 5.24E-04 -8.05E-02 -8.27E-02 -7.50E-02 PASS -8.18E-02 5.31E-04 -8.07E-02 -8.29E-02 -7.50E-02 PASS -8.28E-02 5.43E-04 -8.17E-02 -8.39E-02 -7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 160 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @+/-5V #4 (A) -7.40E-02 -7.50E-02 -7.60E-02 -7.70E-02 -7.80E-02 -7.90E-02 -8.00E-02 -8.10E-02 -8.20E-02 -8.30E-02 -8.40E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.78. Plot of Negative Short-Circuit Current @+/-5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 161 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.78. Raw data for Negative Short-Circuit Current @+/-5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @+/-5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -8.19E-02 -8.22E-02 -8.22E-02 -8.26E-02 -8.25E-02 -8.12E-02 -8.14E-02 -8.13E-02 -8.16E-02 -8.10E-02 -8.14E-02 -8.15E-02 10 -8.17E-02 -8.22E-02 -8.23E-02 -8.26E-02 -8.24E-02 -8.11E-02 -8.14E-02 -8.15E-02 -8.18E-02 -8.10E-02 -8.15E-02 -8.16E-02 20 -8.14E-02 -8.18E-02 -8.19E-02 -8.24E-02 -8.21E-02 -8.09E-02 -8.12E-02 -8.13E-02 -8.15E-02 -8.09E-02 -8.13E-02 -8.13E-02 30 -8.12E-02 -8.17E-02 -8.18E-02 -8.22E-02 -8.20E-02 -8.08E-02 -8.12E-02 -8.12E-02 -8.15E-02 -8.08E-02 -8.12E-02 -8.12E-02 40 -8.12E-02 -8.16E-02 -8.18E-02 -8.23E-02 -8.20E-02 -8.08E-02 -8.11E-02 -8.12E-02 -8.14E-02 -8.08E-02 -8.11E-02 -8.12E-02 50 -8.12E-02 -8.17E-02 -8.18E-02 -8.23E-02 -8.20E-02 -8.08E-02 -8.11E-02 -8.12E-02 -8.15E-02 -8.08E-02 -8.10E-02 -8.10E-02 60 -8.12E-02 -8.17E-02 -8.18E-02 -8.23E-02 -8.20E-02 -8.08E-02 -8.11E-02 -8.12E-02 -8.15E-02 -8.08E-02 -8.09E-02 -8.10E-02 70 -8.11E-02 -8.17E-02 -8.18E-02 -8.24E-02 -8.21E-02 -8.08E-02 -8.12E-02 -8.13E-02 -8.15E-02 -8.09E-02 -8.09E-02 -8.10E-02 75 -8.12E-02 -8.18E-02 -8.18E-02 -8.24E-02 -8.20E-02 -8.09E-02 -8.12E-02 -8.12E-02 -8.15E-02 -8.08E-02 -8.09E-02 -8.09E-02 100 -8.15E-02 -8.20E-02 -8.20E-02 -8.27E-02 -8.23E-02 -8.10E-02 -8.14E-02 -8.14E-02 -8.18E-02 -8.10E-02 -8.09E-02 -8.10E-02 200 -8.24E-02 -8.31E-02 -8.31E-02 -8.38E-02 -8.34E-02 -8.21E-02 -8.24E-02 -8.24E-02 -8.27E-02 -8.20E-02 -8.10E-02 -8.10E-02 -8.18E-02 5.84E-04 -8.06E-02 -8.30E-02 -7.50E-02 PASS -8.18E-02 5.53E-04 -8.07E-02 -8.29E-02 -7.50E-02 PASS -8.15E-02 5.03E-04 -8.05E-02 -8.26E-02 -7.50E-02 PASS -8.14E-02 4.91E-04 -8.04E-02 -8.24E-02 -7.50E-02 PASS -8.14E-02 4.99E-04 -8.04E-02 -8.24E-02 -7.50E-02 PASS -8.14E-02 5.01E-04 -8.04E-02 -8.25E-02 -7.50E-02 PASS -8.14E-02 5.10E-04 -8.04E-02 -8.25E-02 -7.50E-02 PASS -8.15E-02 5.09E-04 -8.04E-02 -8.25E-02 -7.50E-02 PASS -8.15E-02 5.17E-04 -8.04E-02 -8.25E-02 -7.50E-02 PASS -8.17E-02 5.46E-04 -8.06E-02 -8.28E-02 -7.50E-02 PASS -8.27E-02 5.80E-04 -8.15E-02 -8.39E-02 -7.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 162 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX 1.80E-02 Positive Supply Current @5V (A) 1.60E-02 1.40E-02 1.20E-02 1.00E-02 8.00E-03 6.00E-03 4.00E-03 2.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.79. Plot of Positive Supply Current @5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 163 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.79. Raw data for Positive Supply Current @5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Supply Current @5V (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 1.32E-02 1.32E-02 1.34E-02 1.34E-02 1.36E-02 1.34E-02 1.31E-02 1.33E-02 1.31E-02 1.35E-02 1.32E-02 1.34E-02 10 1.31E-02 1.31E-02 1.32E-02 1.32E-02 1.34E-02 1.33E-02 1.29E-02 1.30E-02 1.29E-02 1.34E-02 1.31E-02 1.32E-02 20 1.30E-02 1.29E-02 1.32E-02 1.31E-02 1.33E-02 1.32E-02 1.28E-02 1.29E-02 1.28E-02 1.33E-02 1.31E-02 1.32E-02 30 1.29E-02 1.29E-02 1.31E-02 1.30E-02 1.32E-02 1.31E-02 1.27E-02 1.29E-02 1.28E-02 1.32E-02 1.31E-02 1.32E-02 40 1.28E-02 1.28E-02 1.30E-02 1.28E-02 1.31E-02 1.30E-02 1.26E-02 1.28E-02 1.27E-02 1.31E-02 1.31E-02 1.32E-02 50 1.27E-02 1.27E-02 1.29E-02 1.27E-02 1.29E-02 1.29E-02 1.25E-02 1.27E-02 1.26E-02 1.30E-02 1.31E-02 1.32E-02 60 1.26E-02 1.26E-02 1.28E-02 1.25E-02 1.28E-02 1.28E-02 1.24E-02 1.26E-02 1.25E-02 1.29E-02 1.31E-02 1.32E-02 70 1.25E-02 1.24E-02 1.27E-02 1.24E-02 1.27E-02 1.27E-02 1.23E-02 1.25E-02 1.24E-02 1.28E-02 1.31E-02 1.33E-02 75 1.25E-02 1.24E-02 1.27E-02 1.23E-02 1.27E-02 1.26E-02 1.23E-02 1.25E-02 1.24E-02 1.28E-02 1.32E-02 1.33E-02 100 1.23E-02 1.22E-02 1.25E-02 1.20E-02 1.24E-02 1.24E-02 1.20E-02 1.23E-02 1.21E-02 1.25E-02 1.31E-02 1.33E-02 200 1.10E-02 1.09E-02 1.12E-02 1.07E-02 1.12E-02 1.11E-02 1.08E-02 1.11E-02 1.09E-02 1.12E-02 1.32E-02 1.33E-02 1.33E-02 1.63E-04 1.37E-02 1.30E-02 1.60E-02 PASS 1.32E-02 1.77E-04 1.35E-02 1.28E-02 1.60E-02 PASS 1.31E-02 1.79E-04 1.34E-02 1.27E-02 1.60E-02 PASS 1.30E-02 1.73E-04 1.33E-02 1.26E-02 1.60E-02 PASS 1.29E-02 1.69E-04 1.32E-02 1.25E-02 1.60E-02 PASS 1.28E-02 1.64E-04 1.31E-02 1.24E-02 1.60E-02 PASS 1.27E-02 1.66E-04 1.30E-02 1.23E-02 1.60E-02 PASS 1.26E-02 1.65E-04 1.29E-02 1.22E-02 1.60E-02 PASS 1.25E-02 1.70E-04 1.29E-02 1.22E-02 1.60E-02 PASS 1.23E-02 1.85E-04 1.26E-02 1.19E-02 1.60E-02 PASS 1.10E-02 1.88E-04 1.14E-02 1.06E-02 1.60E-02 PASS An ISO 9001:2008 and DSCC Certified Company 164 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 0.00E+00 Negative Supply Current @5V (A) -2.00E-03 -4.00E-03 -6.00E-03 -8.00E-03 -1.00E-02 -1.20E-02 -1.40E-02 -1.60E-02 -1.80E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.80. Plot of Negative Supply Current @5V (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 165 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.80. Raw data for Negative Supply Current @5V (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Supply Current @5V (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 -1.32E-02 -1.32E-02 -1.34E-02 -1.33E-02 -1.35E-02 -1.33E-02 -1.30E-02 -1.32E-02 -1.31E-02 -1.35E-02 -1.32E-02 -1.33E-02 10 -1.31E-02 -1.30E-02 -1.32E-02 -1.32E-02 -1.33E-02 -1.33E-02 -1.28E-02 -1.30E-02 -1.29E-02 -1.33E-02 -1.30E-02 -1.31E-02 20 -1.29E-02 -1.29E-02 -1.31E-02 -1.30E-02 -1.32E-02 -1.32E-02 -1.27E-02 -1.29E-02 -1.28E-02 -1.32E-02 -1.30E-02 -1.32E-02 30 -1.29E-02 -1.28E-02 -1.30E-02 -1.29E-02 -1.31E-02 -1.31E-02 -1.26E-02 -1.28E-02 -1.27E-02 -1.31E-02 -1.30E-02 -1.31E-02 40 -1.28E-02 -1.27E-02 -1.29E-02 -1.28E-02 -1.30E-02 -1.30E-02 -1.25E-02 -1.27E-02 -1.26E-02 -1.30E-02 -1.31E-02 -1.32E-02 50 -1.27E-02 -1.26E-02 -1.28E-02 -1.26E-02 -1.29E-02 -1.29E-02 -1.25E-02 -1.26E-02 -1.25E-02 -1.29E-02 -1.31E-02 -1.32E-02 60 -1.26E-02 -1.25E-02 -1.28E-02 -1.25E-02 -1.28E-02 -1.27E-02 -1.23E-02 -1.25E-02 -1.24E-02 -1.28E-02 -1.31E-02 -1.32E-02 70 -1.25E-02 -1.24E-02 -1.26E-02 -1.23E-02 -1.27E-02 -1.26E-02 -1.22E-02 -1.24E-02 -1.23E-02 -1.27E-02 -1.31E-02 -1.32E-02 75 -1.24E-02 -1.24E-02 -1.26E-02 -1.23E-02 -1.26E-02 -1.26E-02 -1.22E-02 -1.24E-02 -1.23E-02 -1.27E-02 -1.31E-02 -1.32E-02 100 -1.22E-02 -1.21E-02 -1.24E-02 -1.19E-02 -1.24E-02 -1.23E-02 -1.20E-02 -1.22E-02 -1.21E-02 -1.24E-02 -1.31E-02 -1.32E-02 200 -1.10E-02 -1.09E-02 -1.12E-02 -1.06E-02 -1.11E-02 -1.10E-02 -1.07E-02 -1.10E-02 -1.09E-02 -1.12E-02 -1.31E-02 -1.32E-02 -1.33E-02 1.65E-04 -1.29E-02 -1.36E-02 -1.60E-02 PASS -1.31E-02 1.80E-04 -1.27E-02 -1.35E-02 -1.60E-02 PASS -1.30E-02 1.78E-04 -1.26E-02 -1.34E-02 -1.60E-02 PASS -1.29E-02 1.71E-04 -1.26E-02 -1.33E-02 -1.60E-02 PASS -1.28E-02 1.71E-04 -1.25E-02 -1.32E-02 -1.60E-02 PASS -1.27E-02 1.67E-04 -1.24E-02 -1.30E-02 -1.60E-02 PASS -1.26E-02 1.67E-04 -1.22E-02 -1.29E-02 -1.60E-02 PASS -1.25E-02 1.68E-04 -1.21E-02 -1.28E-02 -1.60E-02 PASS -1.24E-02 1.71E-04 -1.21E-02 -1.28E-02 -1.60E-02 PASS -1.22E-02 1.81E-04 -1.18E-02 -1.26E-02 -1.60E-02 PASS -1.10E-02 1.84E-04 -1.06E-02 -1.13E-02 -1.60E-02 PASS An ISO 9001:2008 and DSCC Certified Company 166 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @5V #1 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.81. Plot of Input Offset Voltage @5V #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 167 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.81. Raw data for Input Offset Voltage @5V #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @5V #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -2.49E-04 -1.05E-04 -9.40E-05 -1.10E-03 -3.01E-04 -8.06E-04 -4.15E-04 -3.64E-04 -4.21E-04 -2.49E-04 -4.36E-04 -5.69E-04 10 -2.87E-04 -1.33E-04 -1.37E-04 -1.13E-03 -3.35E-04 -8.24E-04 -4.47E-04 -4.03E-04 -4.65E-04 -2.87E-04 -4.37E-04 -5.65E-04 20 -3.34E-04 -1.79E-04 -1.92E-04 -1.21E-03 -3.79E-04 -8.72E-04 -5.00E-04 -4.66E-04 -5.21E-04 -3.39E-04 -4.37E-04 -5.69E-04 30 -3.77E-04 -2.24E-04 -2.49E-04 -1.31E-03 -4.23E-04 -9.17E-04 -5.42E-04 -5.19E-04 -5.81E-04 -3.79E-04 -4.38E-04 -5.69E-04 40 -4.27E-04 -2.65E-04 -3.00E-04 -1.42E-03 -4.67E-04 -9.54E-04 -5.77E-04 -5.71E-04 -6.30E-04 -4.08E-04 -4.36E-04 -5.69E-04 50 -4.71E-04 -2.89E-04 -3.50E-04 -1.53E-03 -5.11E-04 -9.89E-04 -6.06E-04 -6.13E-04 -6.71E-04 -4.42E-04 -4.38E-04 -5.69E-04 60 -5.04E-04 -3.16E-04 -3.98E-04 -1.63E-03 -5.46E-04 -1.01E-03 -6.40E-04 -6.58E-04 -7.09E-04 -4.67E-04 -4.39E-04 -5.69E-04 70 -5.35E-04 -3.37E-04 -4.38E-04 -1.73E-03 -5.89E-04 -1.03E-03 -6.68E-04 -6.91E-04 -7.39E-04 -4.78E-04 -4.37E-04 -5.70E-04 75 -5.43E-04 -3.34E-04 -4.47E-04 -1.75E-03 -5.94E-04 -1.02E-03 -6.75E-04 -6.95E-04 -7.51E-04 -4.76E-04 -4.39E-04 -5.69E-04 100 -6.10E-04 -3.95E-04 -5.32E-04 -2.00E-03 -6.82E-04 -1.07E-03 -7.27E-04 -7.67E-04 -8.29E-04 -5.17E-04 -4.40E-04 -5.69E-04 200 -1.14E-03 -7.37E-04 -1.12E-03 -2.39E-03 -1.21E-03 -1.49E-03 -1.19E-03 -1.28E-03 -1.33E-03 -9.14E-04 -4.39E-04 -5.69E-04 -4.10E-04 3.14E-04 2.38E-04 -1.06E-03 -2.00E-03 PASS 2.00E-03 PASS -4.45E-04 3.10E-04 1.96E-04 -1.09E-03 -2.50E-03 PASS 2.50E-03 PASS -5.00E-04 3.19E-04 1.59E-04 -1.16E-03 -2.50E-03 PASS 2.50E-03 PASS -5.53E-04 3.32E-04 1.33E-04 -1.24E-03 -2.50E-03 PASS 2.50E-03 PASS -6.02E-04 3.47E-04 1.16E-04 -1.32E-03 -2.50E-03 PASS 2.50E-03 PASS -6.47E-04 3.66E-04 1.09E-04 -1.40E-03 -4.50E-03 PASS 4.50E-03 PASS -6.88E-04 3.82E-04 1.02E-04 -1.48E-03 -4.50E-03 PASS 4.50E-03 PASS -7.23E-04 4.01E-04 1.05E-04 -1.55E-03 -4.50E-03 PASS 4.50E-03 PASS -7.28E-04 4.06E-04 1.11E-04 -1.57E-03 -4.50E-03 PASS 4.50E-03 PASS -8.13E-04 4.57E-04 1.31E-04 -1.76E-03 -4.50E-03 PASS 4.50E-03 PASS -1.28E-03 4.43E-04 -3.64E-04 -2.19E-03 -4.50E-03 PASS 4.50E-03 PASS An ISO 9001:2008 and DSCC Certified Company 168 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @5V #2 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.82. Plot of Input Offset Voltage @5V #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 169 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.82. Raw data for Input Offset Voltage @5V #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @5V #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -1.92E-04 -8.19E-04 -3.01E-04 -3.88E-04 -3.90E-05 2.53E-04 -7.93E-04 -2.57E-04 -3.63E-04 -3.59E-04 -2.94E-04 -7.14E-04 10 -2.12E-04 -8.40E-04 -3.39E-04 -4.14E-04 -5.50E-05 2.11E-04 -8.20E-04 -2.78E-04 -3.95E-04 -4.59E-04 -2.87E-04 -7.09E-04 20 -2.34E-04 -8.79E-04 -4.00E-04 -4.76E-04 -8.70E-05 1.58E-04 -8.64E-04 -3.24E-04 -4.42E-04 -5.34E-04 -2.87E-04 -7.11E-04 30 -2.74E-04 -9.13E-04 -4.54E-04 -5.40E-04 -1.16E-04 1.03E-04 -9.05E-04 -3.77E-04 -4.96E-04 -5.97E-04 -2.87E-04 -7.07E-04 40 -3.09E-04 -9.33E-04 -5.09E-04 -6.30E-04 -1.33E-04 5.80E-05 -9.38E-04 -4.15E-04 -5.38E-04 -6.70E-04 -2.87E-04 -7.10E-04 50 -3.37E-04 -9.54E-04 -5.59E-04 -7.17E-04 -1.59E-04 1.90E-05 -9.60E-04 -4.42E-04 -5.69E-04 -7.20E-04 -2.87E-04 -7.11E-04 60 -3.56E-04 -9.67E-04 -6.06E-04 -8.12E-04 -1.77E-04 -1.10E-05 -9.98E-04 -4.66E-04 -6.02E-04 -7.73E-04 -2.88E-04 -7.11E-04 70 -3.79E-04 -9.75E-04 -6.30E-04 -9.05E-04 -1.94E-04 -4.50E-05 -1.02E-03 -4.89E-04 -6.30E-04 -8.25E-04 -2.90E-04 -7.11E-04 75 -3.80E-04 -9.75E-04 -6.42E-04 -9.30E-04 -1.95E-04 -4.40E-05 -1.02E-03 -4.92E-04 -6.34E-04 -8.39E-04 -2.90E-04 -7.11E-04 100 -4.36E-04 -1.01E-03 -7.19E-04 -1.15E-03 -2.41E-04 -1.19E-04 -1.07E-03 -5.50E-04 -7.04E-04 -9.41E-04 -2.90E-04 -7.11E-04 200 -8.54E-04 -1.31E-03 -1.28E-03 -1.67E-03 -5.91E-04 -5.33E-04 -1.45E-03 -9.58E-04 -1.19E-03 -1.62E-03 -2.89E-04 -7.12E-04 -3.26E-04 3.18E-04 3.30E-04 -9.82E-04 -2.00E-03 PASS 2.00E-03 PASS -3.60E-04 3.17E-04 2.94E-04 -1.01E-03 -2.50E-03 PASS 2.50E-03 PASS -4.08E-04 3.18E-04 2.49E-04 -1.07E-03 -2.50E-03 PASS 2.50E-03 PASS -4.57E-04 3.17E-04 1.98E-04 -1.11E-03 -2.50E-03 PASS 2.50E-03 PASS -5.02E-04 3.19E-04 1.57E-04 -1.16E-03 -2.50E-03 PASS 2.50E-03 PASS -5.40E-04 3.20E-04 1.21E-04 -1.20E-03 -4.50E-03 PASS 4.50E-03 PASS -5.77E-04 3.28E-04 9.97E-05 -1.25E-03 -4.50E-03 PASS 4.50E-03 PASS -6.09E-04 3.33E-04 7.80E-05 -1.30E-03 -4.50E-03 PASS 4.50E-03 PASS -6.15E-04 3.36E-04 7.89E-05 -1.31E-03 -4.50E-03 PASS 4.50E-03 PASS -6.95E-04 3.56E-04 4.02E-05 -1.43E-03 -4.50E-03 PASS 4.50E-03 PASS -1.15E-03 4.02E-04 -3.17E-04 -1.98E-03 -4.50E-03 PASS 4.50E-03 PASS An ISO 9001:2008 and DSCC Certified Company 170 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @5V #3 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.83. Plot of Input Offset Voltage @5V #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 171 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.83. Raw data for Input Offset Voltage @5V #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @5V #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -4.66E-04 -1.02E-03 -6.88E-04 -3.38E-04 -2.52E-04 -7.59E-04 -2.20E-05 -4.68E-04 -2.83E-04 -2.89E-04 -4.70E-05 -2.80E-04 10 -4.84E-04 -1.04E-03 -7.20E-04 -3.60E-04 -2.74E-04 -8.08E-04 -5.50E-05 -4.68E-04 -3.22E-04 -3.42E-04 -4.30E-05 -2.83E-04 20 -5.29E-04 -1.07E-03 -7.75E-04 -4.27E-04 -3.14E-04 -8.66E-04 -1.03E-04 -4.76E-04 -3.87E-04 -4.15E-04 -4.30E-05 -2.83E-04 30 -5.72E-04 -1.11E-03 -8.18E-04 -5.08E-04 -3.49E-04 -9.24E-04 -1.47E-04 -4.87E-04 -4.53E-04 -4.72E-04 -4.40E-05 -2.84E-04 40 -6.13E-04 -1.14E-03 -8.70E-04 -5.98E-04 -3.81E-04 -9.81E-04 -1.94E-04 -5.00E-04 -5.17E-04 -5.33E-04 -4.50E-05 -2.85E-04 50 -6.42E-04 -1.16E-03 -9.06E-04 -6.82E-04 -4.02E-04 -1.02E-03 -2.28E-04 -5.04E-04 -5.62E-04 -5.88E-04 -4.50E-05 -2.83E-04 60 -6.75E-04 -1.18E-03 -9.34E-04 -7.67E-04 -4.19E-04 -1.06E-03 -2.69E-04 -5.19E-04 -5.99E-04 -6.38E-04 -4.70E-05 -2.83E-04 70 -6.91E-04 -1.19E-03 -9.72E-04 -8.49E-04 -4.26E-04 -1.09E-03 -2.97E-04 -5.23E-04 -6.50E-04 -6.77E-04 -4.70E-05 -2.79E-04 75 -7.00E-04 -1.18E-03 -9.74E-04 -8.74E-04 -4.20E-04 -1.09E-03 -3.06E-04 -5.26E-04 -6.61E-04 -6.87E-04 -4.40E-05 -2.83E-04 100 -7.64E-04 -1.24E-03 -1.04E-03 -1.09E-03 -4.64E-04 -1.17E-03 -3.87E-04 -5.51E-04 -7.71E-04 -7.91E-04 -4.70E-05 -2.82E-04 200 -1.23E-03 -1.50E-03 -1.50E-03 -1.49E-03 -8.06E-04 -1.67E-03 -8.95E-04 -8.23E-04 -1.42E-03 -1.43E-03 -4.70E-05 -2.81E-04 -4.59E-04 2.92E-04 1.44E-04 -1.06E-03 -2.00E-03 PASS 2.00E-03 PASS -4.87E-04 2.90E-04 1.11E-04 -1.08E-03 -2.50E-03 PASS 2.50E-03 PASS -5.37E-04 2.88E-04 5.74E-05 -1.13E-03 -2.50E-03 PASS 2.50E-03 PASS -5.84E-04 2.87E-04 8.07E-06 -1.18E-03 -2.50E-03 PASS 2.50E-03 PASS -6.32E-04 2.85E-04 -4.42E-05 -1.22E-03 -2.50E-03 PASS 2.50E-03 PASS -6.70E-04 2.86E-04 -7.99E-05 -1.26E-03 -4.50E-03 PASS 4.50E-03 PASS -7.06E-04 2.85E-04 -1.18E-04 -1.29E-03 -4.50E-03 PASS 4.50E-03 PASS -7.36E-04 2.87E-04 -1.43E-04 -1.33E-03 -4.50E-03 PASS 4.50E-03 PASS -7.42E-04 2.87E-04 -1.50E-04 -1.33E-03 -4.50E-03 PASS 4.50E-03 PASS -8.26E-04 2.99E-04 -2.08E-04 -1.44E-03 -4.50E-03 PASS 4.50E-03 PASS -1.28E-03 3.20E-04 -6.16E-04 -1.94E-03 -4.50E-03 PASS 4.50E-03 PASS An ISO 9001:2008 and DSCC Certified Company 172 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 5.00E-03 Input Offset Voltage @5V #4 (V) 4.00E-03 3.00E-03 2.00E-03 1.00E-03 0.00E+00 -1.00E-03 -2.00E-03 -3.00E-03 -4.00E-03 -5.00E-03 0 50 100 150 Total Dose (krad(Si)) Figure 5.84. Plot of Input Offset Voltage @5V #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 173 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.84. Raw data for Input Offset Voltage @5V #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Voltage @5V #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -1.06E-03 -2.44E-04 -2.19E-04 -4.35E-04 -9.45E-04 -1.59E-04 -3.15E-04 -9.86E-04 -1.92E-04 -7.50E-05 2.78E-04 -3.31E-04 10 -1.08E-03 -2.79E-04 -2.70E-04 -4.87E-04 -9.71E-04 -1.72E-04 -3.55E-04 -1.01E-03 -2.32E-04 -1.19E-04 2.74E-04 -3.30E-04 20 -1.13E-03 -3.30E-04 -3.40E-04 -5.73E-04 -1.02E-03 -1.96E-04 -4.06E-04 -1.05E-03 -2.94E-04 -1.84E-04 2.77E-04 -3.30E-04 30 -1.17E-03 -3.68E-04 -4.04E-04 -6.58E-04 -1.06E-03 -2.23E-04 -4.52E-04 -1.09E-03 -3.54E-04 -2.36E-04 2.76E-04 -3.31E-04 40 -1.22E-03 -4.10E-04 -4.71E-04 -7.66E-04 -1.11E-03 -2.66E-04 -5.00E-04 -1.13E-03 -4.10E-04 -2.74E-04 2.77E-04 -3.31E-04 50 -1.25E-03 -4.41E-04 -5.38E-04 -8.73E-04 -1.16E-03 -2.96E-04 -5.30E-04 -1.14E-03 -4.40E-04 -3.01E-04 2.77E-04 -3.30E-04 60 -1.28E-03 -4.65E-04 -5.89E-04 -9.63E-04 -1.19E-03 -3.23E-04 -5.73E-04 -1.17E-03 -4.70E-04 -3.24E-04 2.77E-04 -3.32E-04 70 -1.30E-03 -4.81E-04 -6.52E-04 -1.06E-03 -1.24E-03 -3.42E-04 -5.93E-04 -1.19E-03 -5.00E-04 -3.48E-04 2.77E-04 -3.31E-04 75 -1.31E-03 -4.80E-04 -6.66E-04 -1.09E-03 -1.24E-03 -3.41E-04 -5.90E-04 -1.19E-03 -5.01E-04 -3.47E-04 2.78E-04 -3.34E-04 100 -1.36E-03 -5.40E-04 -7.57E-04 -1.33E-03 -1.34E-03 -3.85E-04 -6.51E-04 -1.24E-03 -5.68E-04 -4.03E-04 2.77E-04 -3.34E-04 200 -1.72E-03 -9.84E-04 -1.41E-03 -1.77E-03 -1.91E-03 -7.72E-04 -1.11E-03 -1.65E-03 -1.02E-03 -8.38E-04 2.77E-04 -3.32E-04 -4.63E-04 3.82E-04 3.25E-04 -1.25E-03 -2.00E-03 PASS 2.00E-03 PASS -4.98E-04 3.76E-04 2.78E-04 -1.27E-03 -2.50E-03 PASS 2.50E-03 PASS -5.52E-04 3.72E-04 2.15E-04 -1.32E-03 -2.50E-03 PASS 2.50E-03 PASS -6.02E-04 3.71E-04 1.63E-04 -1.37E-03 -2.50E-03 PASS 2.50E-03 PASS -6.56E-04 3.71E-04 1.10E-04 -1.42E-03 -2.50E-03 PASS 2.50E-03 PASS -6.97E-04 3.73E-04 7.32E-05 -1.47E-03 -4.50E-03 PASS 4.50E-03 PASS -7.35E-04 3.76E-04 4.25E-05 -1.51E-03 -4.50E-03 PASS 4.50E-03 PASS -7.70E-04 3.83E-04 2.13E-05 -1.56E-03 -4.50E-03 PASS 4.50E-03 PASS -7.75E-04 3.87E-04 2.41E-05 -1.57E-03 -4.50E-03 PASS 4.50E-03 PASS -8.57E-04 4.10E-04 -9.33E-06 -1.70E-03 -4.50E-03 PASS 4.50E-03 PASS -1.32E-03 4.22E-04 -4.45E-04 -2.19E-03 -4.50E-03 PASS 4.50E-03 PASS An ISO 9001:2008 and DSCC Certified Company 174 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @5V #1 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.85. Plot of Input Offset Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 175 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.85. Raw data for Input Offset Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -3.00E-08 2.00E-08 3.00E-08 1.00E-08 -2.00E-08 0.00E+00 0.00E+00 0.00E+00 3.00E-08 2.00E-08 0.00E+00 0.00E+00 10 -3.00E-08 4.00E-08 5.00E-08 0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 5.00E-08 3.00E-08 0.00E+00 0.00E+00 20 -3.00E-08 6.00E-08 6.00E-08 1.00E-08 0.00E+00 0.00E+00 0.00E+00 0.00E+00 7.00E-08 6.00E-08 0.00E+00 0.00E+00 30 -4.00E-08 8.00E-08 8.00E-08 2.00E-08 0.00E+00 -1.00E-08 0.00E+00 0.00E+00 1.00E-07 7.00E-08 0.00E+00 0.00E+00 40 -5.00E-08 1.00E-07 1.00E-07 3.00E-08 0.00E+00 -2.00E-08 0.00E+00 1.00E-08 1.10E-07 1.00E-07 0.00E+00 0.00E+00 50 -7.00E-08 1.10E-07 1.20E-07 3.00E-08 0.00E+00 -2.00E-08 -2.00E-08 0.00E+00 1.40E-07 1.10E-07 0.00E+00 0.00E+00 60 -8.00E-08 1.30E-07 1.40E-07 4.00E-08 0.00E+00 -3.00E-08 -2.00E-08 0.00E+00 1.60E-07 1.30E-07 0.00E+00 0.00E+00 70 -9.00E-08 1.40E-07 1.50E-07 5.00E-08 0.00E+00 -3.00E-08 -2.00E-08 0.00E+00 1.80E-07 1.50E-07 0.00E+00 0.00E+00 75 -9.00E-08 1.60E-07 1.60E-07 6.00E-08 0.00E+00 -3.00E-08 -2.00E-08 2.00E-08 1.90E-07 1.60E-07 0.00E+00 0.00E+00 100 -1.00E-07 1.80E-07 2.00E-07 1.00E-07 0.00E+00 -3.00E-08 -2.00E-08 3.00E-08 2.30E-07 2.00E-07 0.00E+00 0.00E+00 200 -2.40E-07 2.70E-07 3.30E-07 7.00E-08 -7.00E-08 -1.20E-07 -1.10E-07 1.00E-08 4.10E-07 3.20E-07 0.00E+00 0.00E+00 6.00E-09 2.01E-08 4.75E-08 -3.55E-08 -4.00E-07 PASS 4.00E-07 PASS 1.40E-08 2.67E-08 6.92E-08 -4.12E-08 -5.00E-07 PASS 5.00E-07 PASS 2.30E-08 3.56E-08 9.65E-08 -5.05E-08 -5.00E-07 PASS 5.00E-07 PASS 3.00E-08 4.81E-08 1.29E-07 -6.93E-08 -5.00E-07 PASS 5.00E-07 PASS 3.80E-08 5.92E-08 1.60E-07 -8.43E-08 -5.00E-07 PASS 5.00E-07 PASS 4.00E-08 7.36E-08 1.92E-07 -1.12E-07 -7.50E-07 PASS 7.50E-07 PASS 4.70E-08 8.58E-08 2.24E-07 -1.30E-07 -7.50E-07 PASS 7.50E-07 PASS 5.30E-08 9.48E-08 2.49E-07 -1.43E-07 -7.50E-07 PASS 7.50E-07 PASS 6.10E-08 9.95E-08 2.66E-07 -1.44E-07 -7.50E-07 PASS 7.50E-07 PASS 7.90E-08 1.18E-07 3.22E-07 -1.64E-07 -1.00E-06 PASS 1.00E-06 PASS 8.70E-08 2.29E-07 5.59E-07 -3.85E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 176 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @5V #2 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.86. Plot of Input Offset Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 177 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.86. Raw data for Input Offset Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 1.00E-08 -2.00E-08 2.00E-08 0.00E+00 -1.00E-08 2.00E-08 0.00E+00 -2.00E-08 0.00E+00 2.00E-08 3.00E-08 2.00E-08 10 1.00E-08 0.00E+00 4.00E-08 0.00E+00 0.00E+00 4.00E-08 2.00E-08 -1.00E-08 1.00E-08 0.00E+00 3.00E-08 2.00E-08 20 0.00E+00 1.00E-08 5.00E-08 2.00E-08 2.00E-08 5.00E-08 4.00E-08 1.00E-08 3.00E-08 0.00E+00 4.00E-08 2.00E-08 30 0.00E+00 3.00E-08 6.00E-08 5.00E-08 4.00E-08 7.00E-08 5.00E-08 3.00E-08 5.00E-08 0.00E+00 4.00E-08 2.00E-08 40 0.00E+00 5.00E-08 6.00E-08 7.00E-08 6.00E-08 9.00E-08 7.00E-08 5.00E-08 7.00E-08 -2.00E-08 4.00E-08 2.00E-08 50 0.00E+00 7.00E-08 7.00E-08 1.00E-07 7.00E-08 1.00E-07 8.00E-08 6.00E-08 9.00E-08 -3.00E-08 4.00E-08 2.00E-08 60 -1.00E-08 8.00E-08 8.00E-08 1.30E-07 1.00E-07 1.20E-07 1.00E-07 8.00E-08 1.00E-07 -4.00E-08 3.00E-08 2.00E-08 70 -1.00E-08 1.00E-07 9.00E-08 1.70E-07 1.10E-07 1.50E-07 1.10E-07 1.00E-07 1.20E-07 -4.00E-08 3.00E-08 2.00E-08 75 -2.00E-08 1.10E-07 9.00E-08 1.80E-07 1.20E-07 1.50E-07 1.20E-07 1.10E-07 1.30E-07 -4.00E-08 3.00E-08 2.00E-08 100 -2.00E-08 1.50E-07 1.10E-07 2.60E-07 1.60E-07 2.00E-07 1.50E-07 1.50E-07 1.70E-07 -6.00E-08 3.00E-08 2.00E-08 200 -1.40E-07 2.70E-07 2.00E-07 3.50E-07 2.70E-07 3.00E-07 2.50E-07 2.70E-07 2.90E-07 -1.90E-07 3.00E-08 2.00E-08 2.00E-09 1.55E-08 3.40E-08 -3.00E-08 -4.00E-07 PASS 4.00E-07 PASS 1.10E-08 1.73E-08 4.67E-08 -2.47E-08 -5.00E-07 PASS 5.00E-07 PASS 2.30E-08 1.89E-08 6.20E-08 -1.60E-08 -5.00E-07 PASS 5.00E-07 PASS 3.80E-08 2.35E-08 8.65E-08 -1.05E-08 -5.00E-07 PASS 5.00E-07 PASS 5.00E-08 3.40E-08 1.20E-07 -2.02E-08 -5.00E-07 PASS 5.00E-07 PASS 6.10E-08 4.28E-08 1.49E-07 -2.74E-08 -7.50E-07 PASS 7.50E-07 PASS 7.40E-08 5.52E-08 1.88E-07 -4.00E-08 -7.50E-07 PASS 7.50E-07 PASS 9.00E-08 6.57E-08 2.26E-07 -4.56E-08 -7.50E-07 PASS 7.50E-07 PASS 9.50E-08 7.04E-08 2.40E-07 -5.04E-08 -7.50E-07 PASS 7.50E-07 PASS 1.27E-07 9.68E-08 3.27E-07 -7.30E-08 -1.00E-06 PASS 1.00E-06 PASS 1.87E-07 1.90E-07 5.79E-07 -2.05E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 178 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @5V #3 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.87. Plot of Input Offset Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 179 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.87. Raw data for Input Offset Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 -2.00E-08 -3.00E-08 3.00E-08 0.00E+00 0.00E+00 -2.00E-08 0.00E+00 0.00E+00 0.00E+00 -1.00E-08 1.00E-08 0.00E+00 10 -2.00E-08 -1.00E-08 4.00E-08 1.00E-08 1.00E-08 -2.00E-08 2.00E-08 -1.00E-08 -1.00E-08 -1.00E-08 2.00E-08 0.00E+00 20 -2.00E-08 0.00E+00 6.00E-08 3.00E-08 3.00E-08 -2.00E-08 4.00E-08 -2.00E-08 -1.00E-08 -2.00E-08 1.00E-08 0.00E+00 30 -2.00E-08 2.00E-08 8.00E-08 6.00E-08 5.00E-08 -3.00E-08 6.00E-08 -2.00E-08 -2.00E-08 -2.00E-08 1.00E-08 0.00E+00 40 -2.00E-08 4.00E-08 1.00E-07 9.00E-08 7.00E-08 -4.00E-08 7.00E-08 -2.00E-08 -3.00E-08 -3.00E-08 2.00E-08 0.00E+00 50 -3.00E-08 5.00E-08 1.10E-07 1.20E-07 9.00E-08 -5.00E-08 9.00E-08 -3.00E-08 -4.00E-08 -4.00E-08 1.00E-08 0.00E+00 60 -3.00E-08 7.00E-08 1.30E-07 1.50E-07 1.10E-07 -6.00E-08 1.10E-07 -3.00E-08 -4.00E-08 -4.00E-08 2.00E-08 0.00E+00 70 -4.00E-08 9.00E-08 1.50E-07 1.80E-07 1.30E-07 -7.00E-08 1.30E-07 -4.00E-08 -5.00E-08 -5.00E-08 1.00E-08 0.00E+00 75 -3.00E-08 1.00E-07 1.60E-07 1.90E-07 1.30E-07 -7.00E-08 1.30E-07 -4.00E-08 -5.00E-08 -5.00E-08 1.00E-08 0.00E+00 100 -3.00E-08 1.30E-07 2.00E-07 2.70E-07 1.70E-07 -8.00E-08 1.60E-07 -4.00E-08 -6.00E-08 -6.00E-08 2.00E-08 0.00E+00 200 -1.10E-07 2.40E-07 3.10E-07 3.90E-07 2.70E-07 -2.10E-07 2.80E-07 -1.50E-07 -2.00E-07 -1.60E-07 1.00E-08 0.00E+00 -5.00E-09 1.65E-08 2.91E-08 -3.91E-08 -4.00E-07 PASS 4.00E-07 PASS -3.31E-25 1.94E-08 4.01E-08 -4.01E-08 -5.00E-07 PASS 5.00E-07 PASS 7.00E-09 3.02E-08 6.94E-08 -5.54E-08 -5.00E-07 PASS 5.00E-07 PASS 1.60E-08 4.27E-08 1.04E-07 -7.23E-08 -5.00E-07 PASS 5.00E-07 PASS 2.30E-08 5.62E-08 1.39E-07 -9.30E-08 -5.00E-07 PASS 5.00E-07 PASS 2.70E-08 7.10E-08 1.74E-07 -1.20E-07 -7.50E-07 PASS 7.50E-07 PASS 3.70E-08 8.39E-08 2.10E-07 -1.36E-07 -7.50E-07 PASS 7.50E-07 PASS 4.30E-08 1.01E-07 2.51E-07 -1.65E-07 -7.50E-07 PASS 7.50E-07 PASS 4.70E-08 1.03E-07 2.60E-07 -1.66E-07 -7.50E-07 PASS 7.50E-07 PASS 6.60E-08 1.32E-07 3.39E-07 -2.07E-07 -1.00E-06 PASS 1.00E-06 PASS 6.60E-08 2.49E-07 5.80E-07 -4.48E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 180 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased 2.00E-06 Input Offset Current @5V #4 (A) 1.50E-06 1.00E-06 5.00E-07 0.00E+00 -5.00E-07 -1.00E-06 -1.50E-06 -2.00E-06 0 50 100 150 Total Dose (krad(Si)) Figure 5.88. Plot of Input Offset Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 181 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.88. Raw data for Input Offset Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Input Offset Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 0.00E+00 0.00E+00 -1.00E-08 0.00E+00 1.00E-08 -2.00E-08 4.00E-08 3.00E-08 0.00E+00 -1.00E-08 0.00E+00 2.00E-08 10 0.00E+00 0.00E+00 -1.00E-08 -1.00E-08 2.00E-08 -2.00E-08 5.00E-08 6.00E-08 2.00E-08 0.00E+00 0.00E+00 2.00E-08 20 0.00E+00 0.00E+00 -1.00E-08 -2.00E-08 3.00E-08 -3.00E-08 6.00E-08 1.00E-07 4.00E-08 2.00E-08 0.00E+00 2.00E-08 30 -1.00E-08 0.00E+00 -1.00E-08 -3.00E-08 4.00E-08 -3.00E-08 7.00E-08 1.20E-07 6.00E-08 4.00E-08 0.00E+00 1.00E-08 40 -2.00E-08 0.00E+00 -2.00E-08 -3.00E-08 5.00E-08 -3.00E-08 8.00E-08 1.50E-07 7.00E-08 6.00E-08 0.00E+00 1.00E-08 50 -3.00E-08 0.00E+00 -3.00E-08 -4.00E-08 5.00E-08 -4.00E-08 8.00E-08 1.80E-07 9.00E-08 7.00E-08 0.00E+00 2.00E-08 60 -3.00E-08 -1.00E-08 -3.00E-08 -4.00E-08 6.00E-08 -4.00E-08 9.00E-08 2.10E-07 1.10E-07 9.00E-08 0.00E+00 1.00E-08 70 -3.00E-08 -2.00E-08 -3.00E-08 -5.00E-08 6.00E-08 -4.00E-08 1.00E-07 2.30E-07 1.20E-07 1.10E-07 0.00E+00 2.00E-08 75 -3.00E-08 -1.00E-08 -4.00E-08 -5.00E-08 7.00E-08 -4.00E-08 1.10E-07 2.50E-07 1.30E-07 1.20E-07 0.00E+00 1.00E-08 100 -3.00E-08 -2.00E-08 -3.00E-08 -3.00E-08 9.00E-08 -3.00E-08 1.30E-07 3.10E-07 1.70E-07 1.50E-07 0.00E+00 2.00E-08 200 -1.40E-07 -9.00E-08 -1.10E-07 -1.90E-07 1.00E-07 -1.10E-07 2.00E-07 6.10E-07 2.70E-07 2.40E-07 0.00E+00 2.00E-08 4.00E-09 1.84E-08 4.20E-08 -3.40E-08 -4.00E-07 PASS 4.00E-07 PASS 1.10E-08 2.64E-08 6.56E-08 -4.36E-08 -5.00E-07 PASS 5.00E-07 PASS 1.90E-08 3.98E-08 1.01E-07 -6.33E-08 -5.00E-07 PASS 5.00E-07 PASS 2.50E-08 4.93E-08 1.27E-07 -7.67E-08 -5.00E-07 PASS 5.00E-07 PASS 3.10E-08 6.05E-08 1.56E-07 -9.38E-08 -5.00E-07 PASS 5.00E-07 PASS 3.30E-08 7.33E-08 1.84E-07 -1.18E-07 -7.50E-07 PASS 7.50E-07 PASS 4.10E-08 8.45E-08 2.16E-07 -1.34E-07 -7.50E-07 PASS 7.50E-07 PASS 4.50E-08 9.37E-08 2.39E-07 -1.49E-07 -7.50E-07 PASS 7.50E-07 PASS 5.10E-08 1.01E-07 2.59E-07 -1.57E-07 -7.50E-07 PASS 7.50E-07 PASS 7.10E-08 1.18E-07 3.15E-07 -1.73E-07 -1.00E-06 PASS 1.00E-06 PASS 7.80E-08 2.54E-07 6.02E-07 -4.46E-07 -1.50E-06 PASS 1.50E-06 PASS An ISO 9001:2008 and DSCC Certified Company 182 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @5V #1 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.89. Plot of Positive Input Bias Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 183 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.89. Raw data for Positive Input Bias Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.30E-07 5.50E-07 4.70E-07 5.00E-07 4.60E-07 5.50E-07 5.80E-07 5.60E-07 5.60E-07 5.50E-07 4.90E-07 5.40E-07 10 5.00E-07 5.20E-07 4.40E-07 4.60E-07 4.30E-07 5.20E-07 5.50E-07 5.10E-07 5.30E-07 5.10E-07 4.90E-07 5.30E-07 20 4.70E-07 5.00E-07 4.20E-07 4.40E-07 4.10E-07 4.90E-07 5.20E-07 4.80E-07 5.10E-07 4.80E-07 4.90E-07 5.30E-07 30 4.50E-07 4.80E-07 4.00E-07 4.20E-07 4.00E-07 4.70E-07 5.00E-07 4.60E-07 5.00E-07 4.60E-07 4.90E-07 5.30E-07 40 4.20E-07 4.70E-07 3.90E-07 4.10E-07 3.90E-07 4.50E-07 4.90E-07 4.40E-07 4.90E-07 4.50E-07 4.90E-07 5.40E-07 50 4.00E-07 4.60E-07 3.80E-07 4.00E-07 3.90E-07 4.40E-07 4.80E-07 4.30E-07 4.80E-07 4.40E-07 4.90E-07 5.40E-07 60 3.90E-07 4.60E-07 3.70E-07 3.90E-07 3.90E-07 4.40E-07 4.70E-07 4.20E-07 4.80E-07 4.40E-07 4.90E-07 5.40E-07 70 3.70E-07 4.60E-07 3.70E-07 3.90E-07 3.90E-07 4.30E-07 4.70E-07 4.10E-07 4.90E-07 4.50E-07 4.90E-07 5.30E-07 75 3.70E-07 4.70E-07 3.80E-07 4.00E-07 4.00E-07 4.40E-07 4.70E-07 4.20E-07 4.90E-07 4.60E-07 4.90E-07 5.40E-07 100 3.50E-07 4.60E-07 3.70E-07 3.90E-07 4.00E-07 4.20E-07 4.60E-07 4.10E-07 4.90E-07 4.50E-07 4.90E-07 5.30E-07 200 6.00E-08 2.40E-07 1.40E-07 1.80E-07 2.40E-07 1.90E-07 2.40E-07 1.30E-07 3.40E-07 2.20E-07 4.90E-07 5.40E-07 5.31E-07 4.07E-08 6.15E-07 4.47E-07 -4.00E-06 PASS 4.00E-06 PASS 4.97E-07 4.00E-08 5.80E-07 4.14E-07 -5.00E-06 PASS 5.00E-06 PASS 4.72E-07 3.74E-08 5.49E-07 3.95E-07 -5.00E-06 PASS 5.00E-06 PASS 4.54E-07 3.69E-08 5.30E-07 3.78E-07 -5.00E-06 PASS 5.00E-06 PASS 4.40E-07 3.71E-08 5.17E-07 3.63E-07 -5.00E-06 PASS 5.00E-06 PASS 4.30E-07 3.65E-08 5.05E-07 3.55E-07 -7.50E-06 PASS 7.50E-06 PASS 4.25E-07 3.87E-08 5.05E-07 3.45E-07 -7.50E-06 PASS 7.50E-06 PASS 4.23E-07 4.32E-08 5.12E-07 3.34E-07 -7.50E-06 PASS 7.50E-06 PASS 4.30E-07 4.19E-08 5.17E-07 3.43E-07 -7.50E-06 PASS 7.50E-06 PASS 4.20E-07 4.45E-08 5.12E-07 3.28E-07 -1.00E-05 PASS 1.00E-05 PASS 1.98E-07 7.70E-08 3.57E-07 3.90E-08 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 184 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @5V #2 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.90. Plot of Positive Input Bias Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 185 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.90. Raw data for Positive Input Bias Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.40E-07 5.10E-07 5.80E-07 4.20E-07 5.00E-07 5.60E-07 5.10E-07 5.10E-07 4.90E-07 4.70E-07 6.00E-07 5.80E-07 10 5.10E-07 4.80E-07 5.50E-07 3.90E-07 4.60E-07 5.20E-07 4.70E-07 4.70E-07 4.50E-07 4.20E-07 5.90E-07 5.70E-07 20 4.90E-07 4.50E-07 5.50E-07 3.60E-07 4.30E-07 4.80E-07 4.40E-07 4.40E-07 4.30E-07 4.00E-07 5.90E-07 5.70E-07 30 4.80E-07 4.30E-07 5.40E-07 3.40E-07 4.20E-07 4.60E-07 4.20E-07 4.30E-07 4.00E-07 3.80E-07 5.90E-07 5.70E-07 40 4.70E-07 4.20E-07 5.40E-07 3.30E-07 4.00E-07 4.30E-07 4.10E-07 4.10E-07 3.90E-07 3.70E-07 5.90E-07 5.80E-07 50 4.60E-07 4.10E-07 5.40E-07 3.20E-07 3.90E-07 4.10E-07 4.00E-07 4.00E-07 3.80E-07 3.50E-07 5.90E-07 5.70E-07 60 4.50E-07 4.00E-07 5.50E-07 3.10E-07 4.00E-07 4.00E-07 3.90E-07 3.90E-07 3.70E-07 3.40E-07 5.90E-07 5.70E-07 70 4.50E-07 4.00E-07 5.50E-07 3.10E-07 3.90E-07 3.90E-07 3.80E-07 3.80E-07 3.70E-07 3.40E-07 5.90E-07 5.70E-07 75 4.60E-07 4.00E-07 5.60E-07 3.20E-07 4.00E-07 3.90E-07 3.90E-07 3.80E-07 3.70E-07 3.40E-07 5.90E-07 5.80E-07 100 4.40E-07 3.90E-07 5.70E-07 3.10E-07 4.00E-07 3.60E-07 3.80E-07 3.70E-07 3.60E-07 3.30E-07 5.90E-07 5.80E-07 200 2.50E-07 1.50E-07 5.30E-07 9.00E-08 1.80E-07 3.00E-08 1.20E-07 1.00E-07 1.10E-07 8.00E-08 5.90E-07 5.70E-07 5.09E-07 4.53E-08 6.03E-07 4.15E-07 -4.00E-06 PASS 4.00E-06 PASS 4.72E-07 4.71E-08 5.69E-07 3.75E-07 -5.00E-06 PASS 5.00E-06 PASS 4.47E-07 5.17E-08 5.54E-07 3.40E-07 -5.00E-06 PASS 5.00E-06 PASS 4.30E-07 5.50E-08 5.44E-07 3.16E-07 -5.00E-06 PASS 5.00E-06 PASS 4.17E-07 5.68E-08 5.34E-07 3.00E-07 -5.00E-06 PASS 5.00E-06 PASS 4.06E-07 6.00E-08 5.30E-07 2.82E-07 -7.50E-06 PASS 7.50E-06 PASS 4.00E-07 6.48E-08 5.34E-07 2.66E-07 -7.50E-06 PASS 7.50E-06 PASS 3.96E-07 6.54E-08 5.31E-07 2.61E-07 -7.50E-06 PASS 7.50E-06 PASS 4.01E-07 6.72E-08 5.40E-07 2.62E-07 -7.50E-06 PASS 7.50E-06 PASS 3.91E-07 7.25E-08 5.41E-07 2.41E-07 -1.00E-05 PASS 1.00E-05 PASS 1.64E-07 1.42E-07 4.57E-07 -1.29E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 186 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @5V #3 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.91. Plot of Positive Input Bias Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 187 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.91. Raw data for Positive Input Bias Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.50E-07 4.80E-07 5.80E-07 4.20E-07 5.10E-07 5.50E-07 5.20E-07 5.30E-07 5.00E-07 4.30E-07 5.50E-07 5.60E-07 10 5.10E-07 4.50E-07 5.50E-07 3.90E-07 4.70E-07 5.10E-07 4.80E-07 5.00E-07 4.60E-07 4.00E-07 5.50E-07 5.50E-07 20 4.90E-07 4.20E-07 5.30E-07 3.70E-07 4.50E-07 4.80E-07 4.50E-07 4.70E-07 4.40E-07 3.70E-07 5.50E-07 5.50E-07 30 4.70E-07 4.00E-07 5.10E-07 3.60E-07 4.30E-07 4.60E-07 4.30E-07 4.60E-07 4.20E-07 3.50E-07 5.50E-07 5.50E-07 40 4.60E-07 3.90E-07 4.90E-07 3.50E-07 4.20E-07 4.40E-07 4.20E-07 4.50E-07 4.10E-07 3.40E-07 5.50E-07 5.50E-07 50 4.50E-07 3.80E-07 4.80E-07 3.40E-07 4.10E-07 4.20E-07 4.10E-07 4.50E-07 4.00E-07 3.30E-07 5.50E-07 5.50E-07 60 4.40E-07 3.80E-07 4.80E-07 3.40E-07 4.10E-07 4.10E-07 4.00E-07 4.40E-07 4.00E-07 3.20E-07 5.50E-07 5.50E-07 70 4.40E-07 3.80E-07 4.70E-07 3.40E-07 4.10E-07 4.00E-07 4.00E-07 4.40E-07 4.00E-07 3.20E-07 5.50E-07 5.50E-07 75 4.40E-07 3.80E-07 4.80E-07 3.50E-07 4.20E-07 4.00E-07 4.10E-07 4.40E-07 4.00E-07 3.20E-07 5.50E-07 5.50E-07 100 4.30E-07 3.80E-07 4.80E-07 3.50E-07 4.20E-07 3.80E-07 3.90E-07 4.40E-07 3.90E-07 3.10E-07 5.50E-07 5.50E-07 200 2.20E-07 1.50E-07 2.50E-07 2.00E-07 2.00E-07 9.00E-08 1.50E-07 2.50E-07 1.70E-07 8.00E-08 5.50E-07 5.50E-07 5.07E-07 5.17E-08 6.14E-07 4.00E-07 -4.00E-06 PASS 4.00E-06 PASS 4.72E-07 4.98E-08 5.75E-07 3.69E-07 -5.00E-06 PASS 5.00E-06 PASS 4.47E-07 5.06E-08 5.51E-07 3.43E-07 -5.00E-06 PASS 5.00E-06 PASS 4.29E-07 4.95E-08 5.31E-07 3.27E-07 -5.00E-06 PASS 5.00E-06 PASS 4.17E-07 4.72E-08 5.14E-07 3.20E-07 -5.00E-06 PASS 5.00E-06 PASS 4.07E-07 4.76E-08 5.05E-07 3.09E-07 -7.50E-06 PASS 7.50E-06 PASS 4.02E-07 4.73E-08 5.00E-07 3.04E-07 -7.50E-06 PASS 7.50E-06 PASS 4.00E-07 4.55E-08 4.94E-07 3.06E-07 -7.50E-06 PASS 7.50E-06 PASS 4.04E-07 4.62E-08 4.99E-07 3.09E-07 -7.50E-06 PASS 7.50E-06 PASS 3.97E-07 4.81E-08 4.96E-07 2.98E-07 -1.00E-05 PASS 1.00E-05 PASS 1.76E-07 5.97E-08 2.99E-07 5.28E-08 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 188 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Positive Input Bias Current @5V #4 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.92. Plot of Positive Input Bias Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 189 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.92. Raw data for Positive Input Bias Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Input Bias Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.30E-07 5.60E-07 4.70E-07 5.40E-07 4.90E-07 5.40E-07 5.90E-07 5.70E-07 5.50E-07 5.20E-07 5.40E-07 5.40E-07 10 4.90E-07 5.30E-07 4.40E-07 5.00E-07 4.60E-07 5.00E-07 5.50E-07 5.50E-07 5.00E-07 4.70E-07 5.30E-07 5.30E-07 20 4.60E-07 5.00E-07 4.10E-07 4.70E-07 4.30E-07 4.60E-07 5.20E-07 5.40E-07 4.70E-07 4.40E-07 5.30E-07 5.30E-07 30 4.30E-07 4.80E-07 4.00E-07 4.50E-07 4.20E-07 4.40E-07 5.10E-07 5.30E-07 4.40E-07 4.10E-07 5.30E-07 5.30E-07 40 4.10E-07 4.60E-07 3.80E-07 4.30E-07 4.10E-07 4.20E-07 5.00E-07 5.30E-07 4.20E-07 4.00E-07 5.30E-07 5.30E-07 50 4.00E-07 4.50E-07 3.70E-07 4.20E-07 4.00E-07 4.10E-07 4.90E-07 5.40E-07 4.10E-07 3.80E-07 5.30E-07 5.30E-07 60 3.80E-07 4.40E-07 3.60E-07 4.10E-07 4.00E-07 4.00E-07 4.80E-07 5.40E-07 4.00E-07 3.80E-07 5.30E-07 5.30E-07 70 3.70E-07 4.40E-07 3.50E-07 4.00E-07 3.90E-07 3.90E-07 4.80E-07 5.50E-07 3.90E-07 3.70E-07 5.30E-07 5.40E-07 75 3.80E-07 4.40E-07 3.60E-07 4.10E-07 4.00E-07 4.00E-07 4.80E-07 5.60E-07 4.00E-07 3.80E-07 5.40E-07 5.40E-07 100 3.50E-07 4.30E-07 3.40E-07 4.00E-07 4.00E-07 3.80E-07 4.70E-07 5.80E-07 3.80E-07 3.70E-07 5.30E-07 5.30E-07 200 5.00E-08 2.00E-07 1.00E-07 1.40E-07 2.10E-07 9.00E-08 2.40E-07 5.30E-07 1.00E-07 7.00E-08 5.30E-07 5.30E-07 5.36E-07 3.60E-08 6.10E-07 4.62E-07 -4.00E-06 PASS 4.00E-06 PASS 4.99E-07 3.67E-08 5.75E-07 4.23E-07 -5.00E-06 PASS 5.00E-06 PASS 4.70E-07 4.03E-08 5.53E-07 3.87E-07 -5.00E-06 PASS 5.00E-06 PASS 4.51E-07 4.28E-08 5.39E-07 3.63E-07 -5.00E-06 PASS 5.00E-06 PASS 4.36E-07 4.70E-08 5.33E-07 3.39E-07 -5.00E-06 PASS 5.00E-06 PASS 4.27E-07 5.25E-08 5.35E-07 3.19E-07 -7.50E-06 PASS 7.50E-06 PASS 4.19E-07 5.43E-08 5.31E-07 3.07E-07 -7.50E-06 PASS 7.50E-06 PASS 4.13E-07 6.09E-08 5.39E-07 2.87E-07 -7.50E-06 PASS 7.50E-06 PASS 4.21E-07 5.93E-08 5.44E-07 2.98E-07 -7.50E-06 PASS 7.50E-06 PASS 4.10E-07 7.07E-08 5.56E-07 2.64E-07 -1.00E-05 PASS 1.00E-05 PASS 1.73E-07 1.41E-07 4.64E-07 -1.18E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 190 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @5V #1 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.93. Plot of Negative Input Bias Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 191 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.93. Raw data for Negative Input Bias Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.60E-07 5.30E-07 4.50E-07 4.80E-07 4.80E-07 5.60E-07 5.80E-07 5.60E-07 5.40E-07 5.30E-07 4.90E-07 5.30E-07 10 5.30E-07 4.80E-07 4.00E-07 4.50E-07 4.40E-07 5.20E-07 5.40E-07 5.10E-07 4.80E-07 4.70E-07 4.90E-07 5.30E-07 20 5.10E-07 4.30E-07 3.50E-07 4.30E-07 4.20E-07 5.00E-07 5.20E-07 4.70E-07 4.40E-07 4.30E-07 4.90E-07 5.30E-07 30 4.90E-07 4.00E-07 3.20E-07 4.00E-07 4.00E-07 4.80E-07 5.10E-07 4.50E-07 4.00E-07 3.90E-07 4.90E-07 5.30E-07 40 4.80E-07 3.70E-07 2.90E-07 3.80E-07 4.00E-07 4.70E-07 5.00E-07 4.30E-07 3.70E-07 3.60E-07 4.90E-07 5.30E-07 50 4.70E-07 3.50E-07 2.60E-07 3.70E-07 4.00E-07 4.60E-07 4.90E-07 4.30E-07 3.50E-07 3.30E-07 4.90E-07 5.30E-07 60 4.60E-07 3.30E-07 2.40E-07 3.50E-07 4.00E-07 4.60E-07 4.90E-07 4.10E-07 3.30E-07 3.10E-07 4.90E-07 5.30E-07 70 4.60E-07 3.20E-07 2.20E-07 3.40E-07 4.00E-07 4.60E-07 4.90E-07 4.00E-07 3.10E-07 2.90E-07 4.90E-07 5.30E-07 75 4.70E-07 3.10E-07 2.10E-07 3.40E-07 4.00E-07 4.70E-07 4.90E-07 4.00E-07 3.10E-07 2.90E-07 4.90E-07 5.30E-07 100 4.50E-07 2.80E-07 1.70E-07 2.90E-07 4.00E-07 4.50E-07 4.80E-07 3.80E-07 2.60E-07 2.50E-07 4.90E-07 5.30E-07 200 3.00E-07 -3.00E-08 -1.80E-07 1.10E-07 3.10E-07 3.10E-07 3.50E-07 1.10E-07 -8.00E-08 -1.00E-07 4.90E-07 5.30E-07 5.27E-07 4.30E-08 6.16E-07 4.38E-07 -4.00E-06 PASS 4.00E-06 PASS 4.82E-07 4.42E-08 5.73E-07 3.91E-07 -5.00E-06 PASS 5.00E-06 PASS 4.50E-07 5.12E-08 5.56E-07 3.44E-07 -5.00E-06 PASS 5.00E-06 PASS 4.24E-07 5.76E-08 5.43E-07 3.05E-07 -5.00E-06 PASS 5.00E-06 PASS 4.05E-07 6.49E-08 5.39E-07 2.71E-07 -5.00E-06 PASS 5.00E-06 PASS 3.91E-07 7.23E-08 5.40E-07 2.42E-07 -7.50E-06 PASS 7.50E-06 PASS 3.78E-07 7.93E-08 5.42E-07 2.14E-07 -7.50E-06 PASS 7.50E-06 PASS 3.69E-07 8.71E-08 5.49E-07 1.89E-07 -7.50E-06 PASS 7.50E-06 PASS 3.69E-07 9.21E-08 5.59E-07 1.79E-07 -7.50E-06 PASS 7.50E-06 PASS 3.41E-07 1.05E-07 5.57E-07 1.25E-07 -1.00E-05 PASS 1.00E-05 PASS 1.10E-07 1.99E-07 5.22E-07 -3.02E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 192 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @5V #2 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.94. Plot of Negative Input Bias Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 193 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.94. Raw data for Negative Input Bias Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.30E-07 5.40E-07 5.60E-07 4.30E-07 5.10E-07 5.40E-07 5.00E-07 5.40E-07 5.00E-07 4.50E-07 5.60E-07 5.60E-07 10 5.00E-07 4.90E-07 5.20E-07 3.90E-07 4.60E-07 4.80E-07 4.50E-07 4.80E-07 4.40E-07 4.20E-07 5.60E-07 5.50E-07 20 4.90E-07 4.40E-07 5.00E-07 3.40E-07 4.20E-07 4.30E-07 4.00E-07 4.40E-07 3.90E-07 4.00E-07 5.60E-07 5.50E-07 30 4.80E-07 4.00E-07 4.80E-07 2.90E-07 3.80E-07 3.80E-07 3.70E-07 4.00E-07 3.60E-07 3.90E-07 5.60E-07 5.50E-07 40 4.70E-07 3.70E-07 4.70E-07 2.60E-07 3.50E-07 3.40E-07 3.40E-07 3.60E-07 3.20E-07 3.80E-07 5.60E-07 5.50E-07 50 4.70E-07 3.40E-07 4.70E-07 2.20E-07 3.20E-07 3.10E-07 3.20E-07 3.40E-07 2.90E-07 3.80E-07 5.60E-07 5.50E-07 60 4.60E-07 3.20E-07 4.70E-07 1.80E-07 3.00E-07 2.80E-07 2.90E-07 3.00E-07 2.70E-07 3.80E-07 5.60E-07 5.50E-07 70 4.70E-07 3.00E-07 4.70E-07 1.50E-07 2.80E-07 2.40E-07 2.70E-07 2.80E-07 2.50E-07 3.80E-07 5.60E-07 5.50E-07 75 4.70E-07 2.90E-07 4.70E-07 1.30E-07 2.80E-07 2.30E-07 2.70E-07 2.70E-07 2.50E-07 3.90E-07 5.60E-07 5.50E-07 100 4.70E-07 2.50E-07 4.60E-07 5.00E-08 2.40E-07 1.70E-07 2.30E-07 2.20E-07 1.90E-07 3.90E-07 5.60E-07 5.50E-07 200 3.90E-07 -1.10E-07 3.30E-07 -2.70E-07 -9.00E-08 -2.70E-07 -1.30E-07 -1.80E-07 -1.80E-07 2.70E-07 5.60E-07 5.50E-07 5.10E-07 4.19E-08 5.97E-07 4.23E-07 -4.00E-06 PASS 4.00E-06 PASS 4.63E-07 3.92E-08 5.44E-07 3.82E-07 -5.00E-06 PASS 5.00E-06 PASS 4.25E-07 4.72E-08 5.22E-07 3.28E-07 -5.00E-06 PASS 5.00E-06 PASS 3.93E-07 5.56E-08 5.08E-07 2.78E-07 -5.00E-06 PASS 5.00E-06 PASS 3.66E-07 6.40E-08 4.98E-07 2.34E-07 -5.00E-06 PASS 5.00E-06 PASS 3.46E-07 7.72E-08 5.05E-07 1.87E-07 -7.50E-06 PASS 7.50E-06 PASS 3.25E-07 8.87E-08 5.08E-07 1.42E-07 -7.50E-06 PASS 7.50E-06 PASS 3.09E-07 1.02E-07 5.20E-07 9.83E-08 -7.50E-06 PASS 7.50E-06 PASS 3.05E-07 1.08E-07 5.27E-07 8.28E-08 -7.50E-06 PASS 7.50E-06 PASS 2.67E-07 1.34E-07 5.43E-07 -8.86E-09 -1.00E-05 PASS 1.00E-05 PASS -2.40E-08 2.53E-07 4.98E-07 -5.46E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 194 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @5V #3 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.95. Plot of Negative Input Bias Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 195 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.95. Raw data for Negative Input Bias Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.70E-07 5.10E-07 5.60E-07 4.10E-07 5.10E-07 5.60E-07 5.10E-07 5.40E-07 5.00E-07 4.40E-07 5.40E-07 5.50E-07 10 5.40E-07 4.60E-07 5.10E-07 3.80E-07 4.60E-07 5.30E-07 4.60E-07 5.10E-07 4.70E-07 4.10E-07 5.30E-07 5.50E-07 20 5.10E-07 4.20E-07 4.60E-07 3.40E-07 4.10E-07 5.10E-07 4.10E-07 4.90E-07 4.60E-07 3.90E-07 5.40E-07 5.50E-07 30 4.90E-07 3.80E-07 4.30E-07 3.00E-07 3.80E-07 4.90E-07 3.80E-07 4.90E-07 4.40E-07 3.70E-07 5.30E-07 5.50E-07 40 4.90E-07 3.50E-07 3.90E-07 2.60E-07 3.50E-07 4.80E-07 3.50E-07 4.80E-07 4.40E-07 3.70E-07 5.30E-07 5.50E-07 50 4.80E-07 3.30E-07 3.70E-07 2.30E-07 3.30E-07 4.70E-07 3.20E-07 4.80E-07 4.40E-07 3.60E-07 5.40E-07 5.50E-07 60 4.80E-07 3.10E-07 3.50E-07 1.90E-07 3.10E-07 4.70E-07 2.90E-07 4.70E-07 4.40E-07 3.60E-07 5.40E-07 5.50E-07 70 4.80E-07 2.90E-07 3.30E-07 1.70E-07 2.90E-07 4.70E-07 2.70E-07 4.80E-07 4.40E-07 3.60E-07 5.30E-07 5.50E-07 75 4.80E-07 2.80E-07 3.20E-07 1.50E-07 2.90E-07 4.80E-07 2.70E-07 4.90E-07 4.60E-07 3.70E-07 5.40E-07 5.50E-07 100 4.70E-07 2.40E-07 2.80E-07 7.00E-08 2.50E-07 4.60E-07 2.30E-07 4.80E-07 4.50E-07 3.60E-07 5.40E-07 5.50E-07 200 3.30E-07 -9.00E-08 -6.00E-08 -1.80E-07 -7.00E-08 3.10E-07 -1.30E-07 4.00E-07 3.70E-07 2.40E-07 5.40E-07 5.50E-07 5.11E-07 5.22E-08 6.19E-07 4.03E-07 -4.00E-06 PASS 4.00E-06 PASS 4.73E-07 5.12E-08 5.79E-07 3.67E-07 -5.00E-06 PASS 5.00E-06 PASS 4.40E-07 5.56E-08 5.55E-07 3.25E-07 -5.00E-06 PASS 5.00E-06 PASS 4.15E-07 6.38E-08 5.47E-07 2.83E-07 -5.00E-06 PASS 5.00E-06 PASS 3.96E-07 7.49E-08 5.51E-07 2.41E-07 -5.00E-06 PASS 5.00E-06 PASS 3.81E-07 8.39E-08 5.54E-07 2.08E-07 -7.50E-06 PASS 7.50E-06 PASS 3.67E-07 9.63E-08 5.66E-07 1.68E-07 -7.50E-06 PASS 7.50E-06 PASS 3.58E-07 1.07E-07 5.78E-07 1.38E-07 -7.50E-06 PASS 7.50E-06 PASS 3.59E-07 1.16E-07 5.98E-07 1.20E-07 -7.50E-06 PASS 7.50E-06 PASS 3.29E-07 1.37E-07 6.12E-07 4.61E-08 -1.00E-05 PASS 1.00E-05 PASS 1.12E-07 2.36E-07 5.99E-07 -3.75E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 196 RLAT Report 10-326 100808 R1.0 Average Biased Ps90%/90% (-KTL) Biased Specification MIN Specification MAX Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Negative Input Bias Current @5V #4 (A) 2.00E-05 1.50E-05 1.00E-05 5.00E-06 0.00E+00 -5.00E-06 -1.00E-05 -1.50E-05 -2.00E-05 0 50 100 150 Total Dose (krad(Si)) Figure 5.96. Plot of Negative Input Bias Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 197 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.96. Raw data for Negative Input Bias Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Input Bias Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status Specification MAX Status 0 5.40E-07 5.50E-07 4.80E-07 5.40E-07 4.80E-07 5.70E-07 5.50E-07 5.40E-07 5.40E-07 5.30E-07 5.30E-07 5.20E-07 10 5.00E-07 5.20E-07 4.50E-07 5.10E-07 4.30E-07 5.20E-07 5.00E-07 4.90E-07 4.80E-07 4.70E-07 5.30E-07 5.20E-07 20 4.70E-07 4.90E-07 4.30E-07 4.90E-07 4.00E-07 4.90E-07 4.70E-07 4.40E-07 4.30E-07 4.20E-07 5.30E-07 5.20E-07 30 4.50E-07 4.80E-07 4.10E-07 4.80E-07 3.80E-07 4.70E-07 4.40E-07 4.10E-07 3.90E-07 3.80E-07 5.30E-07 5.20E-07 40 4.30E-07 4.70E-07 4.00E-07 4.70E-07 3.60E-07 4.60E-07 4.20E-07 3.80E-07 3.50E-07 3.40E-07 5.30E-07 5.20E-07 50 4.20E-07 4.60E-07 3.90E-07 4.60E-07 3.50E-07 4.50E-07 4.10E-07 3.60E-07 3.20E-07 3.10E-07 5.30E-07 5.20E-07 60 4.20E-07 4.60E-07 3.90E-07 4.50E-07 3.40E-07 4.40E-07 3.90E-07 3.40E-07 3.00E-07 2.90E-07 5.30E-07 5.20E-07 70 4.10E-07 4.50E-07 3.90E-07 4.50E-07 3.40E-07 4.40E-07 3.70E-07 3.20E-07 2.70E-07 2.70E-07 5.30E-07 5.20E-07 75 4.10E-07 4.60E-07 3.90E-07 4.60E-07 3.30E-07 4.30E-07 3.70E-07 3.20E-07 2.70E-07 2.60E-07 5.30E-07 5.20E-07 100 3.90E-07 4.40E-07 3.70E-07 4.30E-07 3.10E-07 4.10E-07 3.40E-07 2.70E-07 2.10E-07 2.10E-07 5.30E-07 5.20E-07 200 1.90E-07 3.00E-07 2.10E-07 3.30E-07 1.10E-07 2.00E-07 5.00E-08 -9.00E-08 -1.80E-07 -1.70E-07 5.30E-07 5.20E-07 5.32E-07 2.94E-08 5.93E-07 4.71E-07 -4.00E-06 PASS 4.00E-06 PASS 4.87E-07 2.98E-08 5.49E-07 4.25E-07 -5.00E-06 PASS 5.00E-06 PASS 4.53E-07 3.30E-08 5.21E-07 3.85E-07 -5.00E-06 PASS 5.00E-06 PASS 4.29E-07 4.01E-08 5.12E-07 3.46E-07 -5.00E-06 PASS 5.00E-06 PASS 4.08E-07 4.96E-08 5.10E-07 3.06E-07 -5.00E-06 PASS 5.00E-06 PASS 3.93E-07 5.62E-08 5.09E-07 2.77E-07 -7.50E-06 PASS 7.50E-06 PASS 3.82E-07 6.18E-08 5.10E-07 2.54E-07 -7.50E-06 PASS 7.50E-06 PASS 3.71E-07 6.92E-08 5.14E-07 2.28E-07 -7.50E-06 PASS 7.50E-06 PASS 3.70E-07 7.30E-08 5.21E-07 2.19E-07 -7.50E-06 PASS 7.50E-06 PASS 3.38E-07 8.56E-08 5.15E-07 1.61E-07 -1.00E-05 PASS 1.00E-05 PASS 9.50E-08 1.86E-07 4.80E-07 -2.90E-07 -1.50E-05 PASS 1.50E-05 PASS An ISO 9001:2008 and DSCC Certified Company 198 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @5V #1 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.97. Plot of Common Mode Rejection Ratio @5V #1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 199 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.97. Raw data for Common Mode Rejection Ratio @5V #1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @5V #1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.36E+01 9.54E+01 9.29E+01 9.44E+01 9.26E+01 9.42E+01 9.27E+01 9.36E+01 9.33E+01 9.39E+01 9.38E+01 9.23E+01 10 9.12E+01 9.42E+01 9.00E+01 9.40E+01 9.17E+01 9.27E+01 9.07E+01 9.09E+01 9.13E+01 9.30E+01 9.38E+01 9.24E+01 20 9.15E+01 9.39E+01 9.06E+01 9.39E+01 9.16E+01 9.28E+01 9.11E+01 9.16E+01 9.16E+01 9.27E+01 9.38E+01 9.23E+01 30 9.19E+01 9.38E+01 9.12E+01 9.37E+01 9.17E+01 9.30E+01 9.15E+01 9.22E+01 9.21E+01 9.28E+01 9.38E+01 9.24E+01 40 9.24E+01 9.40E+01 9.16E+01 9.37E+01 9.17E+01 9.32E+01 9.17E+01 9.25E+01 9.24E+01 9.29E+01 9.38E+01 9.24E+01 50 9.27E+01 9.41E+01 9.20E+01 9.34E+01 9.17E+01 9.34E+01 9.19E+01 9.27E+01 9.25E+01 9.29E+01 9.37E+01 9.23E+01 60 9.28E+01 9.42E+01 9.18E+01 9.32E+01 9.16E+01 9.34E+01 9.20E+01 9.26E+01 9.26E+01 9.29E+01 9.37E+01 9.22E+01 70 9.28E+01 9.41E+01 9.19E+01 9.32E+01 9.16E+01 9.34E+01 9.20E+01 9.26E+01 9.25E+01 9.28E+01 9.38E+01 9.23E+01 75 9.27E+01 9.40E+01 9.19E+01 9.30E+01 9.17E+01 9.32E+01 9.20E+01 9.25E+01 9.25E+01 9.27E+01 9.38E+01 9.24E+01 100 9.28E+01 9.39E+01 9.19E+01 9.26E+01 9.14E+01 9.32E+01 9.19E+01 9.25E+01 9.24E+01 9.25E+01 9.38E+01 9.23E+01 200 9.14E+01 9.21E+01 9.04E+01 9.15E+01 9.01E+01 9.17E+01 9.08E+01 9.08E+01 9.09E+01 9.08E+01 9.37E+01 9.23E+01 9.37E+01 8.68E-01 9.54E+01 9.19E+01 7.30E+01 PASS 9.20E+01 1.43E+00 9.49E+01 8.90E+01 7.10E+01 PASS 9.21E+01 1.14E+00 9.45E+01 8.98E+01 7.10E+01 PASS 9.24E+01 9.17E-01 9.43E+01 9.05E+01 7.10E+01 PASS 9.26E+01 8.38E-01 9.43E+01 9.09E+01 7.10E+01 PASS 9.27E+01 7.45E-01 9.42E+01 9.12E+01 6.00E+01 PASS 9.27E+01 7.72E-01 9.43E+01 9.11E+01 6.00E+01 PASS 9.27E+01 7.53E-01 9.42E+01 9.11E+01 6.00E+01 PASS 9.26E+01 6.98E-01 9.41E+01 9.12E+01 6.00E+01 PASS 9.25E+01 7.03E-01 9.39E+01 9.10E+01 6.00E+01 PASS 9.10E+01 6.05E-01 9.23E+01 8.98E+01 6.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 200 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @5V #2 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.98. Plot of Common Mode Rejection Ratio @5V #2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 201 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.98. Raw data for Common Mode Rejection Ratio @5V #2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @5V #2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.38E+01 9.20E+01 9.22E+01 9.41E+01 9.46E+01 9.26E+01 9.27E+01 9.36E+01 9.31E+01 9.24E+01 9.38E+01 9.30E+01 10 9.25E+01 9.02E+01 8.87E+01 9.39E+01 9.30E+01 8.99E+01 9.12E+01 9.14E+01 9.13E+01 8.81E+01 9.38E+01 9.30E+01 20 9.23E+01 9.03E+01 8.98E+01 9.38E+01 9.29E+01 9.06E+01 9.11E+01 9.16E+01 9.14E+01 9.02E+01 9.38E+01 9.30E+01 30 9.23E+01 9.06E+01 9.07E+01 9.35E+01 9.32E+01 9.12E+01 9.15E+01 9.20E+01 9.18E+01 9.17E+01 9.37E+01 9.30E+01 40 9.25E+01 9.10E+01 9.14E+01 9.35E+01 9.34E+01 9.16E+01 9.17E+01 9.23E+01 9.21E+01 9.24E+01 9.37E+01 9.31E+01 50 9.27E+01 9.11E+01 9.18E+01 9.33E+01 9.34E+01 9.18E+01 9.19E+01 9.25E+01 9.22E+01 9.26E+01 9.38E+01 9.30E+01 60 9.29E+01 9.12E+01 9.19E+01 9.30E+01 9.35E+01 9.18E+01 9.19E+01 9.26E+01 9.23E+01 9.27E+01 9.38E+01 9.30E+01 70 9.28E+01 9.12E+01 9.19E+01 9.30E+01 9.35E+01 9.19E+01 9.18E+01 9.26E+01 9.22E+01 9.27E+01 9.37E+01 9.30E+01 75 9.27E+01 9.12E+01 9.18E+01 9.29E+01 9.35E+01 9.17E+01 9.18E+01 9.25E+01 9.22E+01 9.27E+01 9.38E+01 9.31E+01 100 9.29E+01 9.11E+01 9.19E+01 9.26E+01 9.34E+01 9.17E+01 9.17E+01 9.24E+01 9.21E+01 9.26E+01 9.37E+01 9.31E+01 200 9.14E+01 8.98E+01 9.08E+01 9.12E+01 9.16E+01 9.04E+01 9.04E+01 9.09E+01 9.07E+01 9.14E+01 9.38E+01 9.31E+01 9.31E+01 8.76E-01 9.49E+01 9.13E+01 7.30E+01 PASS 9.10E+01 1.82E+00 9.48E+01 8.72E+01 7.10E+01 PASS 9.14E+01 1.27E+00 9.40E+01 8.88E+01 7.10E+01 PASS 9.18E+01 9.71E-01 9.39E+01 8.98E+01 7.10E+01 PASS 9.22E+01 8.16E-01 9.39E+01 9.05E+01 7.10E+01 PASS 9.23E+01 7.28E-01 9.38E+01 9.08E+01 6.00E+01 PASS 9.24E+01 6.94E-01 9.38E+01 9.09E+01 6.00E+01 PASS 9.24E+01 6.82E-01 9.38E+01 9.10E+01 6.00E+01 PASS 9.23E+01 6.85E-01 9.37E+01 9.09E+01 6.00E+01 PASS 9.22E+01 6.58E-01 9.36E+01 9.09E+01 6.00E+01 PASS 9.09E+01 5.61E-01 9.20E+01 8.97E+01 6.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 202 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @5V #3 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.99. Plot of Common Mode Rejection Ratio @5V #3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 203 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.99. Raw data for Common Mode Rejection Ratio @5V #3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @5V #3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.40E+01 9.31E+01 9.33E+01 9.34E+01 9.36E+01 9.22E+01 9.42E+01 9.23E+01 9.32E+01 9.30E+01 9.34E+01 9.48E+01 10 9.23E+01 9.11E+01 9.16E+01 9.32E+01 9.25E+01 8.86E+01 9.19E+01 8.86E+01 8.97E+01 8.99E+01 9.33E+01 9.48E+01 20 9.24E+01 9.14E+01 9.18E+01 9.31E+01 9.24E+01 9.04E+01 9.21E+01 8.98E+01 9.08E+01 9.10E+01 9.34E+01 9.48E+01 30 9.26E+01 9.17E+01 9.21E+01 9.31E+01 9.25E+01 9.18E+01 9.26E+01 9.10E+01 9.18E+01 9.18E+01 9.34E+01 9.48E+01 40 9.30E+01 9.20E+01 9.23E+01 9.28E+01 9.26E+01 9.25E+01 9.29E+01 9.17E+01 9.24E+01 9.21E+01 9.34E+01 9.47E+01 50 9.31E+01 9.22E+01 9.25E+01 9.28E+01 9.26E+01 9.29E+01 9.31E+01 9.19E+01 9.26E+01 9.22E+01 9.35E+01 9.48E+01 60 9.32E+01 9.22E+01 9.25E+01 9.27E+01 9.26E+01 9.30E+01 9.33E+01 9.22E+01 9.27E+01 9.24E+01 9.33E+01 9.48E+01 70 9.32E+01 9.22E+01 9.23E+01 9.24E+01 9.25E+01 9.30E+01 9.31E+01 9.22E+01 9.28E+01 9.22E+01 9.34E+01 9.48E+01 75 9.31E+01 9.21E+01 9.23E+01 9.24E+01 9.24E+01 9.30E+01 9.31E+01 9.22E+01 9.28E+01 9.22E+01 9.34E+01 9.47E+01 100 9.31E+01 9.20E+01 9.21E+01 9.21E+01 9.23E+01 9.30E+01 9.30E+01 9.22E+01 9.28E+01 9.23E+01 9.35E+01 9.48E+01 200 9.14E+01 9.06E+01 9.06E+01 9.09E+01 9.10E+01 9.13E+01 9.15E+01 9.08E+01 9.14E+01 9.09E+01 9.33E+01 9.48E+01 9.32E+01 6.38E-01 9.45E+01 9.19E+01 7.30E+01 PASS 9.09E+01 1.64E+00 9.43E+01 8.76E+01 7.10E+01 PASS 9.15E+01 1.03E+00 9.36E+01 8.94E+01 7.10E+01 PASS 9.21E+01 6.05E-01 9.33E+01 9.08E+01 7.10E+01 PASS 9.24E+01 4.37E-01 9.33E+01 9.15E+01 7.10E+01 PASS 9.26E+01 3.96E-01 9.34E+01 9.18E+01 6.00E+01 PASS 9.27E+01 3.87E-01 9.35E+01 9.19E+01 6.00E+01 PASS 9.26E+01 4.08E-01 9.34E+01 9.18E+01 6.00E+01 PASS 9.26E+01 4.01E-01 9.34E+01 9.17E+01 6.00E+01 PASS 9.25E+01 4.42E-01 9.34E+01 9.16E+01 6.00E+01 PASS 9.10E+01 3.58E-01 9.18E+01 9.03E+01 6.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 204 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Common Mode Rejection Ratio @5V #4 (dB) 1.00E+02 9.00E+01 8.00E+01 7.00E+01 6.00E+01 5.00E+01 4.00E+01 3.00E+01 2.00E+01 1.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.100. Plot of Common Mode Rejection Ratio @5V #4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 205 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.100. Raw data for Common Mode Rejection Ratio @5V #4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Common Mode Rejection Ratio @5V #4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 9.28E+01 9.36E+01 9.38E+01 9.45E+01 9.32E+01 9.30E+01 9.38E+01 9.35E+01 9.40E+01 9.32E+01 9.45E+01 9.38E+01 10 9.01E+01 9.16E+01 8.96E+01 9.44E+01 9.18E+01 9.13E+01 9.28E+01 9.14E+01 9.15E+01 9.20E+01 9.45E+01 9.39E+01 20 9.07E+01 9.17E+01 9.08E+01 9.42E+01 9.20E+01 9.15E+01 9.26E+01 9.17E+01 9.20E+01 9.20E+01 9.45E+01 9.39E+01 30 9.13E+01 9.20E+01 9.17E+01 9.41E+01 9.23E+01 9.19E+01 9.27E+01 9.22E+01 9.27E+01 9.21E+01 9.44E+01 9.39E+01 40 9.19E+01 9.25E+01 9.25E+01 9.40E+01 9.24E+01 9.19E+01 9.29E+01 9.25E+01 9.29E+01 9.23E+01 9.45E+01 9.39E+01 50 9.22E+01 9.27E+01 9.31E+01 9.39E+01 9.24E+01 9.21E+01 9.29E+01 9.26E+01 9.30E+01 9.23E+01 9.45E+01 9.38E+01 60 9.23E+01 9.28E+01 9.31E+01 9.37E+01 9.24E+01 9.21E+01 9.30E+01 9.27E+01 9.31E+01 9.23E+01 9.45E+01 9.38E+01 70 9.22E+01 9.28E+01 9.31E+01 9.34E+01 9.23E+01 9.21E+01 9.30E+01 9.27E+01 9.32E+01 9.23E+01 9.46E+01 9.39E+01 75 9.22E+01 9.27E+01 9.31E+01 9.33E+01 9.23E+01 9.21E+01 9.31E+01 9.26E+01 9.29E+01 9.21E+01 9.45E+01 9.39E+01 100 9.23E+01 9.27E+01 9.32E+01 9.32E+01 9.23E+01 9.19E+01 9.30E+01 9.26E+01 9.28E+01 9.19E+01 9.45E+01 9.39E+01 200 9.10E+01 9.13E+01 9.16E+01 9.19E+01 9.09E+01 9.04E+01 9.14E+01 9.11E+01 9.13E+01 9.05E+01 9.44E+01 9.39E+01 9.35E+01 5.27E-01 9.46E+01 9.25E+01 7.30E+01 PASS 9.16E+01 1.33E+00 9.44E+01 8.89E+01 7.10E+01 PASS 9.19E+01 9.91E-01 9.40E+01 8.99E+01 7.10E+01 PASS 9.23E+01 7.54E-01 9.38E+01 9.07E+01 7.10E+01 PASS 9.26E+01 5.99E-01 9.38E+01 9.13E+01 7.10E+01 PASS 9.27E+01 5.44E-01 9.38E+01 9.16E+01 6.00E+01 PASS 9.28E+01 4.95E-01 9.38E+01 9.17E+01 6.00E+01 PASS 9.27E+01 4.73E-01 9.37E+01 9.17E+01 6.00E+01 PASS 9.26E+01 4.55E-01 9.36E+01 9.17E+01 6.00E+01 PASS 9.26E+01 4.71E-01 9.36E+01 9.16E+01 6.00E+01 PASS 9.12E+01 4.60E-01 9.21E+01 9.02E+01 6.00E+01 PASS An ISO 9001:2008 and DSCC Certified Company 206 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=500 #1 (V/mV) 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.101. Plot of Large Signal Voltage Gain @5V RL=500 #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 207 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.101. Raw data for Large Signal Voltage Gain @5V RL=500 #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=500 #1 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.20E+00 2.20E+00 2.00E+00 10 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.20E+00 2.00E+00 20 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.20E+00 2.00E+00 30 2.10E+00 2.00E+00 1.90E+00 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.20E+00 2.00E+00 40 2.00E+00 2.00E+00 1.90E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.20E+00 2.00E+00 50 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.20E+00 2.00E+00 60 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.20E+00 2.00E+00 70 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.00E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.20E+00 2.00E+00 75 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.20E+00 2.00E+00 100 1.90E+00 1.80E+00 1.80E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.80E+00 1.80E+00 1.90E+00 2.20E+00 2.00E+00 200 1.70E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.70E+00 2.20E+00 2.00E+00 2.10E+00 4.71E-02 2.20E+00 2.00E+00 1.00E+00 PASS 2.08E+00 4.22E-02 2.17E+00 1.99E+00 9.00E-01 PASS 2.05E+00 5.27E-02 2.16E+00 1.94E+00 8.00E-01 PASS 2.04E+00 6.99E-02 2.18E+00 1.90E+00 8.00E-01 PASS 1.99E+00 3.16E-02 2.06E+00 1.92E+00 8.00E-01 PASS 1.98E+00 4.22E-02 2.07E+00 1.89E+00 6.00E-01 PASS 1.96E+00 5.16E-02 2.07E+00 1.85E+00 6.00E-01 PASS 1.93E+00 4.83E-02 2.03E+00 1.83E+00 6.00E-01 PASS 1.92E+00 4.22E-02 2.01E+00 1.83E+00 6.00E-01 PASS 1.85E+00 5.27E-02 1.96E+00 1.74E+00 5.00E-01 PASS 1.66E+00 5.16E-02 1.77E+00 1.55E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 208 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=500 #2 (V/mV) 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.102. Plot of Large Signal Voltage Gain @5V RL=500 #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 209 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.102. Raw data for Large Signal Voltage Gain @5V RL=500 #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=500 #2 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.20E+00 2.00E+00 2.00E+00 2.00E+00 1.90E+00 2.00E+00 2.20E+00 2.10E+00 10 2.10E+00 1.90E+00 2.10E+00 2.20E+00 2.20E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 20 2.10E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 30 2.10E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.10E+00 40 2.00E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.10E+00 50 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.10E+00 60 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.90E+00 2.20E+00 2.10E+00 70 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.80E+00 2.10E+00 2.10E+00 75 1.90E+00 1.80E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.80E+00 1.80E+00 1.90E+00 1.80E+00 2.10E+00 2.10E+00 100 1.90E+00 1.80E+00 1.80E+00 1.90E+00 1.90E+00 1.80E+00 1.80E+00 1.80E+00 1.80E+00 1.80E+00 2.20E+00 2.10E+00 200 1.70E+00 1.60E+00 1.70E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 2.10E+00 2.10E+00 2.05E+00 9.72E-02 2.25E+00 1.85E+00 1.00E+00 PASS 2.03E+00 1.16E-01 2.27E+00 1.79E+00 9.00E-01 PASS 2.00E+00 8.16E-02 2.17E+00 1.83E+00 8.00E-01 PASS 1.98E+00 9.19E-02 2.17E+00 1.79E+00 8.00E-01 PASS 1.96E+00 8.43E-02 2.13E+00 1.79E+00 8.00E-01 PASS 1.93E+00 4.83E-02 2.03E+00 1.83E+00 6.00E-01 PASS 1.92E+00 6.32E-02 2.05E+00 1.79E+00 6.00E-01 PASS 1.91E+00 7.38E-02 2.06E+00 1.76E+00 6.00E-01 PASS 1.88E+00 7.89E-02 2.04E+00 1.72E+00 6.00E-01 PASS 1.83E+00 4.83E-02 1.93E+00 1.73E+00 5.00E-01 PASS 1.64E+00 5.16E-02 1.75E+00 1.53E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 210 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=500 #3 (V/mV) 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.103. Plot of Large Signal Voltage Gain @5V RL=500 #3 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 211 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.103. Raw data for Large Signal Voltage Gain @5V RL=500 #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=500 #3 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.20E+00 2.00E+00 2.10E+00 2.20E+00 2.20E+00 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 10 2.10E+00 2.00E+00 2.10E+00 2.20E+00 2.20E+00 2.10E+00 2.10E+00 1.90E+00 2.10E+00 2.00E+00 2.10E+00 2.10E+00 20 2.10E+00 2.00E+00 2.00E+00 2.20E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 30 2.10E+00 2.00E+00 2.00E+00 2.20E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 40 2.10E+00 1.90E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 2.00E+00 1.90E+00 2.10E+00 2.10E+00 50 2.00E+00 1.90E+00 2.00E+00 2.10E+00 2.00E+00 2.00E+00 1.90E+00 1.80E+00 2.00E+00 1.90E+00 2.10E+00 2.10E+00 60 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.90E+00 2.10E+00 2.10E+00 70 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.90E+00 2.10E+00 2.10E+00 75 2.00E+00 1.80E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.80E+00 1.90E+00 1.90E+00 2.10E+00 2.10E+00 100 1.90E+00 1.80E+00 1.80E+00 1.90E+00 1.90E+00 1.80E+00 1.80E+00 1.80E+00 1.90E+00 1.80E+00 2.10E+00 2.10E+00 200 1.70E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.70E+00 1.70E+00 1.60E+00 1.70E+00 1.60E+00 2.10E+00 2.10E+00 2.11E+00 7.38E-02 2.26E+00 1.96E+00 1.00E+00 PASS 2.08E+00 9.19E-02 2.27E+00 1.89E+00 9.00E-01 PASS 2.03E+00 8.23E-02 2.20E+00 1.86E+00 8.00E-01 PASS 2.03E+00 8.23E-02 2.20E+00 1.86E+00 8.00E-01 PASS 2.00E+00 8.16E-02 2.17E+00 1.83E+00 8.00E-01 PASS 1.96E+00 8.43E-02 2.13E+00 1.79E+00 6.00E-01 PASS 1.92E+00 6.32E-02 2.05E+00 1.79E+00 6.00E-01 PASS 1.92E+00 6.32E-02 2.05E+00 1.79E+00 6.00E-01 PASS 1.91E+00 7.38E-02 2.06E+00 1.76E+00 6.00E-01 PASS 1.84E+00 5.16E-02 1.95E+00 1.73E+00 5.00E-01 PASS 1.66E+00 5.16E-02 1.77E+00 1.55E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 212 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=500 #4 (V/mV) 2.50E+00 2.00E+00 1.50E+00 1.00E+00 5.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.104. Plot of Large Signal Voltage Gain @5V RL=500 #4 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 213 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.104. Raw data for Large Signal Voltage Gain @5V RL=500 #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=500 #4 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 2.10E+00 2.10E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.10E+00 2.00E+00 10 2.10E+00 2.00E+00 2.10E+00 2.00E+00 2.00E+00 2.10E+00 2.10E+00 2.10E+00 2.00E+00 2.10E+00 2.10E+00 2.00E+00 20 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.10E+00 2.00E+00 30 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.10E+00 2.00E+00 40 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 2.00E+00 1.90E+00 2.00E+00 2.10E+00 2.00E+00 50 2.00E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 2.00E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.00E+00 60 1.90E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.00E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.00E+00 70 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.00E+00 75 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 1.90E+00 2.10E+00 2.00E+00 100 1.80E+00 1.80E+00 1.90E+00 1.80E+00 1.80E+00 1.90E+00 1.90E+00 1.80E+00 1.80E+00 1.80E+00 2.10E+00 2.00E+00 200 1.70E+00 1.60E+00 1.70E+00 1.60E+00 1.70E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 2.10E+00 2.00E+00 2.08E+00 4.22E-02 2.17E+00 1.99E+00 1.00E+00 PASS 2.06E+00 5.16E-02 2.17E+00 1.95E+00 9.00E-01 PASS 2.00E+00 0.00E+00 2.00E+00 2.00E+00 8.00E-01 PASS 2.00E+00 0.00E+00 2.00E+00 2.00E+00 8.00E-01 PASS 1.99E+00 3.16E-02 2.06E+00 1.92E+00 8.00E-01 PASS 1.94E+00 5.16E-02 2.05E+00 1.83E+00 6.00E-01 PASS 1.92E+00 4.22E-02 2.01E+00 1.83E+00 6.00E-01 PASS 1.90E+00 0.00E+00 1.90E+00 1.90E+00 6.00E-01 PASS 1.90E+00 0.00E+00 1.90E+00 1.90E+00 6.00E-01 PASS 1.83E+00 4.83E-02 1.93E+00 1.73E+00 5.00E-01 PASS 1.65E+00 5.27E-02 1.76E+00 1.54E+00 4.00E-01 PASS An ISO 9001:2008 and DSCC Certified Company 214 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=100 #1 (V/mV) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.105. Plot of Large Signal Voltage Gain @5V RL=100 #1 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 215 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.105. Raw data for Large Signal Voltage Gain @5V RL=100 #1 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=100 #1 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.50E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.60E+00 10 1.60E+00 1.60E+00 1.50E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.70E+00 1.60E+00 20 1.60E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.70E+00 1.60E+00 30 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.70E+00 1.60E+00 40 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.70E+00 1.60E+00 50 1.50E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 60 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 70 1.50E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 75 1.50E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 100 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.70E+00 1.60E+00 200 1.30E+00 1.20E+00 1.20E+00 1.20E+00 1.30E+00 1.20E+00 1.30E+00 1.20E+00 1.20E+00 1.20E+00 1.70E+00 1.60E+00 1.63E+00 6.75E-02 1.77E+00 1.49E+00 7.00E-01 PASS 1.60E+00 4.71E-02 1.70E+00 1.50E+00 6.00E-01 PASS 1.59E+00 5.68E-02 1.71E+00 1.47E+00 5.50E-01 PASS 1.55E+00 5.27E-02 1.66E+00 1.44E+00 5.50E-01 PASS 1.55E+00 5.27E-02 1.66E+00 1.44E+00 5.50E-01 PASS 1.52E+00 4.22E-02 1.61E+00 1.43E+00 4.50E-01 PASS 1.51E+00 3.16E-02 1.58E+00 1.44E+00 4.50E-01 PASS 1.48E+00 4.22E-02 1.57E+00 1.39E+00 4.50E-01 PASS 1.48E+00 4.22E-02 1.57E+00 1.39E+00 4.50E-01 PASS 1.42E+00 4.22E-02 1.51E+00 1.33E+00 4.00E-01 PASS 1.23E+00 4.83E-02 1.33E+00 1.13E+00 3.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 216 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=100 #2 (V/mV) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.106. Plot of Large Signal Voltage Gain @5V RL=100 #2 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 217 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.106. Raw data for Large Signal Voltage Gain @5V RL=100 #2 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=100 #2 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.70E+00 1.50E+00 1.60E+00 1.70E+00 1.70E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.50E+00 1.70E+00 1.70E+00 10 1.60E+00 1.40E+00 1.60E+00 1.70E+00 1.70E+00 1.50E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.70E+00 1.70E+00 20 1.60E+00 1.40E+00 1.60E+00 1.70E+00 1.70E+00 1.50E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.70E+00 1.70E+00 30 1.60E+00 1.40E+00 1.50E+00 1.70E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.70E+00 1.70E+00 40 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.70E+00 1.70E+00 50 1.50E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.70E+00 1.70E+00 60 1.50E+00 1.40E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.70E+00 1.70E+00 70 1.50E+00 1.40E+00 1.50E+00 1.60E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.70E+00 1.70E+00 75 1.50E+00 1.40E+00 1.50E+00 1.60E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.70E+00 1.70E+00 100 1.40E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.40E+00 1.40E+00 1.30E+00 1.40E+00 1.40E+00 1.70E+00 1.70E+00 200 1.30E+00 1.20E+00 1.30E+00 1.30E+00 1.30E+00 1.20E+00 1.20E+00 1.20E+00 1.20E+00 1.20E+00 1.70E+00 1.70E+00 1.59E+00 8.76E-02 1.77E+00 1.41E+00 7.00E-01 PASS 1.54E+00 1.07E-01 1.76E+00 1.32E+00 6.00E-01 PASS 1.54E+00 1.07E-01 1.76E+00 1.32E+00 5.50E-01 PASS 1.52E+00 9.19E-02 1.71E+00 1.33E+00 5.50E-01 PASS 1.52E+00 7.89E-02 1.68E+00 1.36E+00 5.50E-01 PASS 1.50E+00 6.67E-02 1.64E+00 1.36E+00 4.50E-01 PASS 1.49E+00 7.38E-02 1.64E+00 1.34E+00 4.50E-01 PASS 1.45E+00 7.07E-02 1.60E+00 1.30E+00 4.50E-01 PASS 1.45E+00 7.07E-02 1.60E+00 1.30E+00 4.50E-01 PASS 1.41E+00 5.68E-02 1.53E+00 1.29E+00 4.00E-01 PASS 1.24E+00 5.16E-02 1.35E+00 1.13E+00 3.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 218 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=100 #3 (V/mV) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.107. Plot of Large Signal Voltage Gain @5V RL=100 #3 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 219 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.107. Raw data for Large Signal Voltage Gain @5V RL=100 #3 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=100 #3 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.70E+00 1.60E+00 1.60E+00 1.80E+00 1.70E+00 1.50E+00 1.60E+00 1.50E+00 1.70E+00 1.60E+00 1.60E+00 1.60E+00 10 1.60E+00 1.50E+00 1.60E+00 1.80E+00 1.70E+00 1.60E+00 1.60E+00 1.50E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 20 1.60E+00 1.50E+00 1.60E+00 1.80E+00 1.70E+00 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.50E+00 1.60E+00 1.60E+00 30 1.60E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 40 1.60E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 50 1.60E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 60 1.50E+00 1.40E+00 1.50E+00 1.60E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 70 1.50E+00 1.40E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 75 1.50E+00 1.40E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.60E+00 1.60E+00 100 1.40E+00 1.40E+00 1.40E+00 1.50E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.60E+00 1.60E+00 200 1.30E+00 1.20E+00 1.20E+00 1.30E+00 1.30E+00 1.20E+00 1.20E+00 1.20E+00 1.30E+00 1.20E+00 1.60E+00 1.60E+00 1.63E+00 9.49E-02 1.83E+00 1.43E+00 7.00E-01 PASS 1.61E+00 8.76E-02 1.79E+00 1.43E+00 6.00E-01 PASS 1.59E+00 9.94E-02 1.80E+00 1.38E+00 5.50E-01 PASS 1.53E+00 8.23E-02 1.70E+00 1.36E+00 5.50E-01 PASS 1.53E+00 8.23E-02 1.70E+00 1.36E+00 5.50E-01 PASS 1.53E+00 8.23E-02 1.70E+00 1.36E+00 4.50E-01 PASS 1.50E+00 6.67E-02 1.64E+00 1.36E+00 4.50E-01 PASS 1.49E+00 5.68E-02 1.61E+00 1.37E+00 4.50E-01 PASS 1.48E+00 6.32E-02 1.61E+00 1.35E+00 4.50E-01 PASS 1.42E+00 4.22E-02 1.51E+00 1.33E+00 4.00E-01 PASS 1.24E+00 5.16E-02 1.35E+00 1.13E+00 3.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 220 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Large Signal Voltage Gain @5V RL=100 #4 (V/mV) 1.80E+00 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.108. Plot of Large Signal Voltage Gain @5V RL=100 #4 (V/mV) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 221 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.108. Raw data for Large Signal Voltage Gain @5V RL=100 #4 (V/mV) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Large Signal Voltage Gain @5V RL=100 #4 (V/mV) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.60E+00 1.60E+00 1.70E+00 1.50E+00 1.60E+00 1.70E+00 1.70E+00 1.60E+00 1.60E+00 1.70E+00 1.70E+00 1.60E+00 10 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.70E+00 1.60E+00 20 1.60E+00 1.50E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.70E+00 1.60E+00 30 1.50E+00 1.50E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.60E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 40 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 50 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 60 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.70E+00 1.60E+00 70 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.70E+00 1.60E+00 75 1.50E+00 1.40E+00 1.50E+00 1.40E+00 1.50E+00 1.50E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.70E+00 1.60E+00 100 1.40E+00 1.40E+00 1.50E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.40E+00 1.70E+00 1.60E+00 200 1.20E+00 1.20E+00 1.30E+00 1.20E+00 1.30E+00 1.20E+00 1.30E+00 1.20E+00 1.20E+00 1.20E+00 1.70E+00 1.60E+00 1.63E+00 6.75E-02 1.77E+00 1.49E+00 7.00E-01 PASS 1.60E+00 2.34E-16 1.60E+00 1.60E+00 6.00E-01 PASS 1.57E+00 4.83E-02 1.67E+00 1.47E+00 5.50E-01 PASS 1.52E+00 4.22E-02 1.61E+00 1.43E+00 5.50E-01 PASS 1.50E+00 0.00E+00 1.50E+00 1.50E+00 5.50E-01 PASS 1.50E+00 0.00E+00 1.50E+00 1.50E+00 4.50E-01 PASS 1.50E+00 0.00E+00 1.50E+00 1.50E+00 4.50E-01 PASS 1.46E+00 5.16E-02 1.57E+00 1.35E+00 4.50E-01 PASS 1.45E+00 5.27E-02 1.56E+00 1.34E+00 4.50E-01 PASS 1.41E+00 3.16E-02 1.48E+00 1.34E+00 4.00E-01 PASS 1.23E+00 4.83E-02 1.33E+00 1.13E+00 3.50E-01 PASS An ISO 9001:2008 and DSCC Certified Company 222 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 1:2 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.109. Plot of Channel Separation @5V 1:2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 223 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.109. Raw data for Channel Separation @5V 1:2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 1:2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.08E+02 1.02E+02 1.55E+02 1.18E+02 9.80E+01 1.11E+02 9.63E+01 1.07E+02 1.04E+02 1.03E+02 1.11E+02 1.06E+02 10 1.17E+02 1.18E+02 1.04E+02 1.14E+02 1.04E+02 1.13E+02 1.10E+02 1.10E+02 1.13E+02 1.10E+02 1.10E+02 1.01E+02 20 1.09E+02 1.05E+02 1.03E+02 1.04E+02 1.10E+02 9.93E+01 1.05E+02 1.03E+02 9.75E+01 9.70E+01 1.14E+02 1.13E+02 30 1.11E+02 9.41E+01 1.10E+02 1.03E+02 1.08E+02 1.08E+02 9.67E+01 1.02E+02 1.16E+02 1.10E+02 1.09E+02 1.30E+02 40 9.50E+01 1.19E+02 9.66E+01 1.06E+02 1.05E+02 9.74E+01 1.07E+02 9.66E+01 1.06E+02 1.15E+02 1.10E+02 1.18E+02 50 1.26E+02 1.07E+02 1.28E+02 1.07E+02 1.13E+02 1.04E+02 1.02E+02 1.02E+02 1.07E+02 1.26E+02 1.47E+02 1.17E+02 60 1.05E+02 1.04E+02 1.01E+02 1.08E+02 9.95E+01 1.02E+02 1.04E+02 1.09E+02 1.09E+02 1.02E+02 1.09E+02 1.07E+02 70 1.18E+02 1.09E+02 9.96E+01 1.06E+02 9.89E+01 1.12E+02 1.03E+02 9.94E+01 9.62E+01 1.08E+02 1.17E+02 1.02E+02 75 1.12E+02 1.07E+02 1.13E+02 9.84E+01 1.07E+02 1.06E+02 9.92E+01 1.08E+02 1.13E+02 1.02E+02 1.20E+02 1.05E+02 100 1.13E+02 9.69E+01 1.16E+02 1.09E+02 9.64E+01 1.15E+02 1.11E+02 1.30E+02 1.03E+02 9.47E+01 1.02E+02 1.11E+02 200 9.72E+01 1.02E+02 1.18E+02 1.05E+02 1.05E+02 9.94E+01 1.09E+02 1.23E+02 9.74E+01 9.56E+01 1.07E+02 1.05E+02 1.10E+02 1.70E+01 1.45E+02 7.51E+01 8.10E+01 PASS 1.11E+02 4.66E+00 1.21E+02 1.02E+02 8.10E+01 PASS 1.03E+02 4.43E+00 1.12E+02 9.40E+01 8.10E+01 PASS 1.06E+02 6.80E+00 1.20E+02 9.18E+01 8.10E+01 PASS 1.04E+02 8.09E+00 1.21E+02 8.76E+01 8.10E+01 PASS 1.12E+02 1.06E+01 1.34E+02 9.01E+01 8.10E+01 PASS 1.04E+02 3.44E+00 1.11E+02 9.73E+01 8.10E+01 PASS 1.05E+02 6.78E+00 1.19E+02 9.10E+01 8.10E+01 PASS 1.06E+02 5.29E+00 1.17E+02 9.55E+01 8.10E+01 PASS 1.09E+02 1.11E+01 1.32E+02 8.57E+01 8.10E+01 PASS 1.05E+02 9.22E+00 1.24E+02 8.61E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 224 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 1:3 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.110. Plot of Channel Separation @5V 1:3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 225 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.110. Raw data for Channel Separation @5V 1:3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 1:3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.16E+02 1.08E+02 1.08E+02 1.18E+02 1.17E+02 1.03E+02 9.79E+01 1.35E+02 1.06E+02 1.28E+02 1.14E+02 1.10E+02 10 1.20E+02 1.13E+02 1.07E+02 1.04E+02 1.07E+02 1.02E+02 1.02E+02 9.80E+01 1.02E+02 1.06E+02 1.08E+02 1.13E+02 20 9.27E+01 1.10E+02 1.09E+02 1.12E+02 1.15E+02 1.04E+02 9.99E+01 1.12E+02 1.04E+02 1.03E+02 1.06E+02 1.23E+02 30 1.07E+02 1.05E+02 1.09E+02 1.06E+02 1.03E+02 1.16E+02 1.05E+02 1.26E+02 1.26E+02 1.04E+02 1.04E+02 9.89E+01 40 9.88E+01 1.03E+02 1.04E+02 1.02E+02 1.08E+02 1.02E+02 1.00E+02 1.06E+02 9.75E+01 9.90E+01 1.18E+02 1.10E+02 50 1.05E+02 1.14E+02 1.02E+02 1.07E+02 1.09E+02 1.03E+02 1.04E+02 1.03E+02 1.04E+02 1.12E+02 1.10E+02 9.73E+01 60 1.14E+02 1.03E+02 1.04E+02 1.06E+02 1.18E+02 1.10E+02 9.83E+01 1.14E+02 1.08E+02 1.01E+02 1.01E+02 9.72E+01 70 1.06E+02 1.25E+02 1.23E+02 1.03E+02 1.20E+02 9.90E+01 1.16E+02 1.02E+02 1.05E+02 1.05E+02 1.09E+02 9.78E+01 75 1.16E+02 1.02E+02 1.16E+02 1.12E+02 1.08E+02 1.09E+02 1.00E+02 1.04E+02 1.02E+02 1.05E+02 1.05E+02 1.14E+02 100 1.26E+02 1.15E+02 1.02E+02 9.32E+01 1.22E+02 1.08E+02 9.90E+01 1.06E+02 1.24E+02 1.08E+02 1.04E+02 1.06E+02 200 9.83E+01 9.88E+01 1.03E+02 9.35E+01 9.88E+01 1.11E+02 1.06E+02 1.12E+02 1.08E+02 1.05E+02 1.01E+02 1.09E+02 1.14E+02 1.14E+01 1.37E+02 9.01E+01 8.10E+01 PASS 1.06E+02 6.34E+00 1.19E+02 9.29E+01 8.10E+01 PASS 1.06E+02 6.85E+00 1.20E+02 9.20E+01 8.10E+01 PASS 1.11E+02 8.94E+00 1.29E+02 9.22E+01 8.10E+01 PASS 1.02E+02 3.21E+00 1.08E+02 9.52E+01 8.10E+01 PASS 1.06E+02 4.02E+00 1.15E+02 9.80E+01 8.10E+01 PASS 1.08E+02 6.27E+00 1.21E+02 9.46E+01 8.10E+01 PASS 1.10E+02 9.59E+00 1.30E+02 9.04E+01 8.10E+01 PASS 1.07E+02 5.79E+00 1.19E+02 9.54E+01 8.10E+01 PASS 1.10E+02 1.12E+01 1.33E+02 8.71E+01 8.10E+01 PASS 1.03E+02 5.98E+00 1.16E+02 9.10E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 226 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 1:4 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.111. Plot of Channel Separation @5V 1:4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 227 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.111. Raw data for Channel Separation @5V 1:4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 1:4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.11E+02 1.22E+02 1.02E+02 1.15E+02 1.15E+02 1.05E+02 1.03E+02 9.94E+01 9.97E+01 1.09E+02 1.03E+02 1.01E+02 10 1.01E+02 1.23E+02 1.04E+02 1.09E+02 1.01E+02 1.08E+02 1.07E+02 1.04E+02 1.03E+02 9.75E+01 1.04E+02 9.53E+01 20 1.21E+02 1.02E+02 1.04E+02 1.11E+02 1.24E+02 1.00E+02 1.20E+02 1.03E+02 1.26E+02 1.03E+02 9.76E+01 1.09E+02 30 1.11E+02 1.01E+02 1.16E+02 1.01E+02 1.13E+02 1.28E+02 1.02E+02 1.07E+02 1.02E+02 1.00E+02 1.16E+02 1.02E+02 40 1.01E+02 9.64E+01 1.15E+02 9.91E+01 1.20E+02 1.09E+02 1.13E+02 1.05E+02 1.02E+02 9.58E+01 1.08E+02 1.36E+02 50 1.08E+02 1.11E+02 1.01E+02 9.96E+01 1.05E+02 1.07E+02 1.05E+02 1.01E+02 1.07E+02 9.58E+01 1.08E+02 9.48E+01 60 1.04E+02 1.08E+02 9.91E+01 1.13E+02 1.08E+02 1.19E+02 1.04E+02 1.11E+02 1.05E+02 1.04E+02 1.01E+02 1.14E+02 70 9.81E+01 9.38E+01 1.15E+02 9.90E+01 1.04E+02 9.56E+01 1.07E+02 9.58E+01 1.02E+02 1.10E+02 1.02E+02 1.17E+02 75 9.69E+01 9.96E+01 1.10E+02 1.19E+02 9.94E+01 1.08E+02 1.00E+02 9.64E+01 1.18E+02 1.08E+02 1.03E+02 1.04E+02 100 1.13E+02 9.38E+01 9.61E+01 1.12E+02 1.06E+02 1.04E+02 1.01E+02 1.13E+02 1.17E+02 1.07E+02 1.03E+02 9.98E+01 200 1.12E+02 1.02E+02 1.17E+02 1.23E+02 1.07E+02 1.13E+02 1.02E+02 1.10E+02 1.09E+02 1.00E+02 1.59E+02 1.01E+02 1.08E+02 7.43E+00 1.23E+02 9.26E+01 8.10E+01 PASS 1.06E+02 6.94E+00 1.20E+02 9.14E+01 8.10E+01 PASS 1.12E+02 1.04E+01 1.33E+02 9.01E+01 8.10E+01 PASS 1.08E+02 9.06E+00 1.27E+02 8.94E+01 8.10E+01 PASS 1.06E+02 8.32E+00 1.23E+02 8.84E+01 8.10E+01 PASS 1.04E+02 4.64E+00 1.14E+02 9.44E+01 8.10E+01 PASS 1.07E+02 5.79E+00 1.19E+02 9.55E+01 8.10E+01 PASS 1.02E+02 6.84E+00 1.16E+02 8.78E+01 8.10E+01 PASS 1.06E+02 8.34E+00 1.23E+02 8.84E+01 8.10E+01 PASS 1.06E+02 7.66E+00 1.22E+02 9.04E+01 8.10E+01 PASS 1.09E+02 7.12E+00 1.24E+02 9.46E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 228 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 2:1 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.112. Plot of Channel Separation @5V 2:1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 229 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.112. Raw data for Channel Separation @5V 2:1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 2:1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.09E+02 1.26E+02 1.14E+02 1.08E+02 1.16E+02 1.10E+02 9.77E+01 1.08E+02 1.00E+02 1.06E+02 1.12E+02 1.21E+02 10 1.26E+02 9.98E+01 9.80E+01 1.14E+02 1.04E+02 1.24E+02 1.02E+02 1.04E+02 1.07E+02 1.07E+02 1.03E+02 1.09E+02 20 1.36E+02 1.00E+02 9.90E+01 1.00E+02 1.14E+02 1.02E+02 1.08E+02 1.18E+02 1.05E+02 1.03E+02 1.50E+02 1.09E+02 30 1.23E+02 1.04E+02 1.12E+02 9.68E+01 1.14E+02 9.97E+01 1.20E+02 1.17E+02 1.08E+02 9.76E+01 9.85E+01 1.01E+02 40 1.13E+02 1.01E+02 1.10E+02 1.08E+02 1.09E+02 9.81E+01 9.80E+01 1.30E+02 1.06E+02 1.10E+02 9.63E+01 1.02E+02 50 1.12E+02 1.05E+02 1.09E+02 1.05E+02 1.01E+02 1.09E+02 1.04E+02 1.01E+02 1.06E+02 1.14E+02 1.21E+02 1.05E+02 60 1.06E+02 1.15E+02 1.13E+02 1.08E+02 1.11E+02 1.12E+02 1.10E+02 1.01E+02 1.03E+02 1.55E+02 1.23E+02 1.08E+02 70 1.17E+02 1.08E+02 1.07E+02 1.04E+02 1.00E+02 1.24E+02 1.16E+02 1.07E+02 1.42E+02 1.03E+02 1.14E+02 1.01E+02 75 1.07E+02 1.00E+02 1.06E+02 1.05E+02 1.02E+02 1.05E+02 1.24E+02 1.14E+02 9.49E+01 1.02E+02 1.03E+02 1.06E+02 100 9.81E+01 1.25E+02 9.98E+01 9.91E+01 1.28E+02 1.03E+02 1.07E+02 1.02E+02 1.13E+02 1.17E+02 1.16E+02 1.11E+02 200 1.12E+02 9.80E+01 9.81E+01 1.01E+02 1.13E+02 1.01E+02 1.12E+02 9.57E+01 1.06E+02 1.02E+02 1.13E+02 1.05E+02 1.09E+02 7.98E+00 1.26E+02 9.29E+01 8.10E+01 PASS 1.09E+02 9.56E+00 1.28E+02 8.88E+01 8.10E+01 PASS 1.09E+02 1.16E+01 1.32E+02 8.46E+01 8.10E+01 PASS 1.09E+02 9.47E+00 1.29E+02 8.97E+01 8.10E+01 PASS 1.08E+02 9.26E+00 1.27E+02 8.92E+01 8.10E+01 PASS 1.07E+02 4.32E+00 1.16E+02 9.77E+01 8.10E+01 PASS 1.13E+02 1.54E+01 1.45E+02 8.16E+01 8.10E+01 PASS 1.13E+02 1.26E+01 1.39E+02 8.68E+01 8.10E+01 PASS 1.06E+02 8.05E+00 1.22E+02 8.92E+01 8.10E+01 PASS 1.09E+02 1.08E+01 1.31E+02 8.67E+01 8.10E+01 PASS 1.04E+02 6.47E+00 1.17E+02 9.06E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 230 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 2:3 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.113. Plot of Channel Separation @5V 2:3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 231 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.113. Raw data for Channel Separation @5V 2:3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 2:3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.04E+02 1.03E+02 1.02E+02 1.06E+02 1.03E+02 1.07E+02 9.66E+01 1.07E+02 1.32E+02 9.58E+01 1.21E+02 9.85E+01 10 1.13E+02 1.12E+02 1.08E+02 9.69E+01 1.14E+02 1.00E+02 1.08E+02 1.20E+02 1.13E+02 1.09E+02 1.07E+02 1.25E+02 20 1.13E+02 9.88E+01 1.06E+02 9.79E+01 9.66E+01 9.64E+01 1.09E+02 1.12E+02 1.00E+02 1.00E+02 1.16E+02 1.19E+02 30 1.12E+02 1.04E+02 1.02E+02 1.03E+02 1.06E+02 1.05E+02 1.15E+02 1.21E+02 1.12E+02 1.02E+02 1.18E+02 1.09E+02 40 1.01E+02 9.99E+01 9.82E+01 1.27E+02 1.07E+02 1.08E+02 1.16E+02 1.14E+02 1.00E+02 1.05E+02 9.57E+01 1.10E+02 50 9.82E+01 1.07E+02 1.26E+02 1.16E+02 1.05E+02 1.08E+02 1.00E+02 1.18E+02 1.02E+02 9.73E+01 1.09E+02 1.35E+02 60 1.01E+02 1.06E+02 1.07E+02 1.17E+02 9.70E+01 1.10E+02 1.01E+02 1.04E+02 9.62E+01 9.81E+01 1.23E+02 1.39E+02 70 1.03E+02 1.12E+02 1.10E+02 1.11E+02 9.86E+01 1.00E+02 1.02E+02 1.06E+02 1.07E+02 9.60E+01 1.29E+02 1.17E+02 75 1.13E+02 1.04E+02 1.03E+02 1.16E+02 9.92E+01 1.20E+02 9.93E+01 1.17E+02 9.93E+01 1.06E+02 1.22E+02 1.06E+02 100 1.00E+02 1.15E+02 1.13E+02 1.20E+02 1.02E+02 1.12E+02 1.01E+02 1.29E+02 1.13E+02 9.49E+01 9.71E+01 1.36E+02 200 1.03E+02 9.51E+01 1.04E+02 9.76E+01 1.15E+02 1.08E+02 1.34E+02 1.09E+02 1.09E+02 1.10E+02 1.01E+02 1.01E+02 1.06E+02 9.94E+00 1.26E+02 8.51E+01 8.10E+01 PASS 1.09E+02 6.72E+00 1.23E+02 9.54E+01 8.10E+01 PASS 1.03E+02 6.35E+00 1.16E+02 8.99E+01 8.10E+01 PASS 1.08E+02 6.37E+00 1.21E+02 9.51E+01 8.10E+01 PASS 1.07E+02 9.06E+00 1.26E+02 8.87E+01 8.10E+01 PASS 1.08E+02 9.50E+00 1.27E+02 8.82E+01 8.10E+01 PASS 1.04E+02 6.44E+00 1.17E+02 9.04E+01 8.10E+01 PASS 1.05E+02 5.48E+00 1.16E+02 9.32E+01 8.10E+01 PASS 1.08E+02 8.11E+00 1.25E+02 9.10E+01 8.10E+01 PASS 1.10E+02 1.03E+01 1.31E+02 8.85E+01 8.10E+01 PASS 1.08E+02 1.06E+01 1.30E+02 8.64E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 232 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.40E+02 Channel Separation @5V 2:4 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.114. Plot of Channel Separation @5V 2:4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 233 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.114. Raw data for Channel Separation @5V 2:4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 2:4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.01E+02 1.39E+02 1.03E+02 1.02E+02 1.04E+02 1.13E+02 1.01E+02 1.27E+02 1.03E+02 1.17E+02 1.34E+02 1.08E+02 10 1.07E+02 1.01E+02 1.17E+02 9.38E+01 1.07E+02 1.13E+02 1.26E+02 1.02E+02 1.14E+02 1.04E+02 1.11E+02 1.01E+02 20 1.19E+02 1.02E+02 1.02E+02 1.34E+02 9.84E+01 1.13E+02 1.05E+02 1.15E+02 9.71E+01 1.12E+02 9.95E+01 1.07E+02 30 1.06E+02 1.11E+02 9.83E+01 1.04E+02 9.85E+01 1.42E+02 1.43E+02 1.20E+02 1.07E+02 1.10E+02 1.14E+02 1.29E+02 40 1.19E+02 1.24E+02 1.29E+02 1.07E+02 9.80E+01 1.34E+02 1.06E+02 1.02E+02 1.24E+02 1.06E+02 9.72E+01 1.05E+02 50 1.17E+02 1.16E+02 1.15E+02 1.01E+02 1.12E+02 1.15E+02 1.10E+02 1.09E+02 9.29E+01 1.07E+02 9.86E+01 1.03E+02 60 1.02E+02 1.01E+02 1.06E+02 1.02E+02 1.10E+02 9.89E+01 1.07E+02 1.07E+02 9.68E+01 9.98E+01 1.09E+02 1.08E+02 70 1.01E+02 1.12E+02 1.10E+02 1.01E+02 1.20E+02 1.09E+02 9.83E+01 9.80E+01 1.00E+02 1.11E+02 1.11E+02 9.68E+01 75 9.33E+01 1.13E+02 1.01E+02 1.00E+02 9.94E+01 1.18E+02 1.24E+02 1.06E+02 1.11E+02 1.15E+02 1.07E+02 9.76E+01 100 1.07E+02 9.64E+01 1.00E+02 9.68E+01 9.86E+01 1.02E+02 1.12E+02 1.24E+02 1.04E+02 1.06E+02 9.93E+01 1.12E+02 200 1.30E+02 9.87E+01 1.21E+02 1.22E+02 1.27E+02 1.04E+02 1.07E+02 9.99E+01 9.86E+01 1.26E+02 1.00E+02 1.11E+02 1.11E+02 1.31E+01 1.38E+02 8.40E+01 8.10E+01 PASS 1.08E+02 9.30E+00 1.28E+02 8.92E+01 8.10E+01 PASS 1.10E+02 1.13E+01 1.33E+02 8.63E+01 8.10E+01 PASS 1.14E+02 1.64E+01 1.48E+02 8.00E+01 8.10E+01 PASS 1.15E+02 1.25E+01 1.41E+02 8.89E+01 8.10E+01 PASS 1.09E+02 7.69E+00 1.25E+02 9.36E+01 8.10E+01 PASS 1.03E+02 4.21E+00 1.12E+02 9.43E+01 8.10E+01 PASS 1.06E+02 7.42E+00 1.21E+02 9.07E+01 8.10E+01 PASS 1.08E+02 9.59E+00 1.28E+02 8.82E+01 8.10E+01 PASS 1.05E+02 8.38E+00 1.22E+02 8.75E+01 8.10E+01 PASS 1.13E+02 1.30E+01 1.40E+02 8.67E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 234 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.40E+02 Channel Separation @5V 3:1 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.115. Plot of Channel Separation @5V 3:1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 235 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.115. Raw data for Channel Separation @5V 3:1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 3:1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.09E+02 1.14E+02 1.24E+02 1.18E+02 1.39E+02 1.15E+02 1.11E+02 1.10E+02 1.06E+02 1.01E+02 1.05E+02 9.59E+01 10 1.07E+02 1.14E+02 1.10E+02 1.12E+02 1.04E+02 1.03E+02 1.03E+02 1.28E+02 9.92E+01 1.19E+02 9.56E+01 1.01E+02 20 1.14E+02 1.03E+02 9.47E+01 1.07E+02 9.96E+01 9.92E+01 1.20E+02 9.69E+01 1.00E+02 1.05E+02 1.07E+02 1.04E+02 30 9.93E+01 9.82E+01 9.66E+01 1.05E+02 1.27E+02 1.06E+02 1.02E+02 1.00E+02 1.07E+02 1.22E+02 1.13E+02 1.02E+02 40 9.91E+01 1.01E+02 1.12E+02 1.18E+02 9.39E+01 1.29E+02 9.69E+01 1.16E+02 9.63E+01 1.03E+02 9.86E+01 1.08E+02 50 1.02E+02 1.16E+02 1.02E+02 1.13E+02 1.10E+02 1.00E+02 1.07E+02 1.04E+02 1.10E+02 1.02E+02 1.08E+02 1.11E+02 60 9.70E+01 1.34E+02 1.20E+02 9.37E+01 1.04E+02 1.06E+02 9.84E+01 1.04E+02 1.12E+02 1.28E+02 1.00E+02 1.14E+02 70 1.04E+02 9.66E+01 1.02E+02 1.09E+02 1.04E+02 1.03E+02 1.09E+02 1.07E+02 1.06E+02 1.03E+02 9.70E+01 1.06E+02 75 1.02E+02 1.10E+02 1.01E+02 9.45E+01 1.02E+02 9.78E+01 9.61E+01 1.06E+02 1.03E+02 1.12E+02 9.92E+01 1.09E+02 100 1.31E+02 1.16E+02 1.00E+02 1.04E+02 9.95E+01 1.01E+02 1.08E+02 1.17E+02 1.03E+02 1.17E+02 1.05E+02 1.10E+02 200 1.34E+02 9.53E+01 1.09E+02 9.92E+01 9.38E+01 9.33E+01 1.01E+02 9.99E+01 9.79E+01 1.15E+02 9.76E+01 1.01E+02 1.15E+02 1.08E+01 1.37E+02 9.22E+01 8.10E+01 PASS 1.10E+02 8.75E+00 1.28E+02 9.18E+01 8.10E+01 PASS 1.04E+02 7.82E+00 1.20E+02 8.77E+01 8.10E+01 PASS 1.06E+02 1.04E+01 1.28E+02 8.49E+01 8.10E+01 PASS 1.06E+02 1.15E+01 1.30E+02 8.26E+01 8.10E+01 PASS 1.07E+02 5.52E+00 1.18E+02 9.53E+01 8.10E+01 PASS 1.10E+02 1.36E+01 1.38E+02 8.16E+01 8.10E+01 PASS 1.04E+02 3.64E+00 1.12E+02 9.68E+01 8.10E+01 PASS 1.02E+02 5.72E+00 1.14E+02 9.06E+01 8.10E+01 PASS 1.10E+02 1.03E+01 1.31E+02 8.83E+01 8.10E+01 PASS 1.04E+02 1.26E+01 1.30E+02 7.77E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 236 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 3:2 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.116. Plot of Channel Separation @5V 3:2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 237 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.116. Raw data for Channel Separation @5V 3:2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 3:2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.07E+02 1.14E+02 9.98E+01 1.17E+02 1.03E+02 1.04E+02 1.02E+02 9.87E+01 1.03E+02 1.08E+02 1.02E+02 9.99E+01 10 1.01E+02 1.07E+02 1.03E+02 1.13E+02 1.09E+02 1.16E+02 1.09E+02 1.04E+02 1.13E+02 1.21E+02 1.11E+02 1.00E+02 20 9.81E+01 1.12E+02 1.09E+02 1.02E+02 1.10E+02 1.09E+02 1.06E+02 1.01E+02 1.08E+02 1.20E+02 1.01E+02 1.11E+02 30 1.20E+02 1.03E+02 1.04E+02 1.10E+02 1.08E+02 1.00E+02 1.08E+02 1.01E+02 1.09E+02 1.01E+02 1.14E+02 1.25E+02 40 9.95E+01 9.42E+01 9.76E+01 1.14E+02 1.04E+02 9.83E+01 1.09E+02 1.22E+02 1.01E+02 1.06E+02 1.05E+02 9.70E+01 50 1.07E+02 1.16E+02 1.09E+02 1.36E+02 1.15E+02 1.05E+02 1.02E+02 1.37E+02 9.98E+01 1.04E+02 1.03E+02 1.15E+02 60 9.41E+01 1.02E+02 1.11E+02 1.03E+02 1.01E+02 1.12E+02 9.52E+01 1.06E+02 9.21E+01 1.02E+02 1.07E+02 1.03E+02 70 1.03E+02 1.07E+02 9.50E+01 1.21E+02 1.08E+02 1.07E+02 1.10E+02 1.01E+02 9.98E+01 1.02E+02 9.55E+01 1.10E+02 75 1.06E+02 1.05E+02 1.01E+02 1.14E+02 1.02E+02 1.13E+02 1.11E+02 1.02E+02 9.66E+01 9.85E+01 1.15E+02 9.83E+01 100 1.22E+02 1.19E+02 1.09E+02 1.10E+02 1.11E+02 1.08E+02 1.30E+02 9.63E+01 1.11E+02 1.19E+02 1.04E+02 1.16E+02 200 1.02E+02 1.03E+02 1.28E+02 1.42E+02 1.12E+02 1.04E+02 1.11E+02 1.00E+02 1.06E+02 1.18E+02 1.04E+02 1.07E+02 1.06E+02 5.90E+00 1.18E+02 9.35E+01 8.10E+01 PASS 1.10E+02 6.25E+00 1.23E+02 9.67E+01 8.10E+01 PASS 1.07E+02 6.10E+00 1.20E+02 9.47E+01 8.10E+01 PASS 1.06E+02 6.10E+00 1.19E+02 9.38E+01 8.10E+01 PASS 1.05E+02 8.42E+00 1.22E+02 8.71E+01 8.10E+01 PASS 1.13E+02 1.34E+01 1.41E+02 8.55E+01 8.10E+01 PASS 1.02E+02 6.80E+00 1.16E+02 8.78E+01 8.10E+01 PASS 1.05E+02 7.06E+00 1.20E+02 9.08E+01 8.10E+01 PASS 1.05E+02 6.10E+00 1.17E+02 9.22E+01 8.10E+01 PASS 1.13E+02 9.28E+00 1.32E+02 9.41E+01 8.10E+01 PASS 1.13E+02 1.33E+01 1.40E+02 8.50E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 238 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN 1.40E+02 Channel Separation @5V 3:4 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.117. Plot of Channel Separation @5V 3:4 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 239 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.117. Raw data for Channel Separation @5V 3:4 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 3:4 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.16E+02 9.82E+01 1.15E+02 1.14E+02 1.09E+02 1.08E+02 9.80E+01 1.02E+02 1.05E+02 1.00E+02 1.06E+02 1.15E+02 10 1.02E+02 1.18E+02 1.01E+02 1.10E+02 1.02E+02 1.07E+02 1.02E+02 1.13E+02 1.18E+02 1.07E+02 1.06E+02 9.55E+01 20 1.13E+02 1.25E+02 9.89E+01 1.19E+02 1.06E+02 9.79E+01 1.06E+02 1.02E+02 1.04E+02 1.13E+02 1.23E+02 1.02E+02 30 1.15E+02 1.04E+02 9.93E+01 1.27E+02 1.06E+02 1.21E+02 1.10E+02 9.67E+01 1.05E+02 1.08E+02 9.27E+01 1.23E+02 40 1.58E+02 1.23E+02 1.14E+02 1.01E+02 1.49E+02 1.20E+02 1.06E+02 1.16E+02 1.09E+02 1.14E+02 1.04E+02 1.05E+02 50 1.15E+02 9.91E+01 1.11E+02 1.04E+02 1.02E+02 1.09E+02 1.13E+02 9.90E+01 1.06E+02 1.08E+02 9.43E+01 1.17E+02 60 1.20E+02 1.02E+02 1.31E+02 9.97E+01 1.18E+02 1.09E+02 1.31E+02 1.38E+02 9.42E+01 1.42E+02 1.15E+02 1.12E+02 70 9.82E+01 1.10E+02 1.04E+02 9.97E+01 1.16E+02 1.01E+02 1.07E+02 1.01E+02 1.03E+02 1.07E+02 1.06E+02 9.90E+01 75 1.02E+02 1.05E+02 1.13E+02 9.87E+01 1.01E+02 1.06E+02 1.13E+02 9.65E+01 1.05E+02 9.70E+01 1.13E+02 1.34E+02 100 9.75E+01 1.37E+02 1.02E+02 1.01E+02 1.26E+02 1.03E+02 9.96E+01 1.25E+02 1.04E+02 1.03E+02 1.35E+02 1.03E+02 200 1.10E+02 9.34E+01 1.31E+02 9.50E+01 1.01E+02 1.13E+02 1.03E+02 1.14E+02 1.11E+02 1.06E+02 9.88E+01 1.17E+02 1.06E+02 6.93E+00 1.21E+02 9.21E+01 8.10E+01 PASS 1.08E+02 6.63E+00 1.22E+02 9.43E+01 8.10E+01 PASS 1.08E+02 8.69E+00 1.26E+02 9.05E+01 8.10E+01 PASS 1.09E+02 9.49E+00 1.29E+02 8.96E+01 8.10E+01 PASS 1.21E+02 1.84E+01 1.59E+02 8.30E+01 8.10E+01 PASS 1.07E+02 5.54E+00 1.18E+02 9.51E+01 8.10E+01 PASS 1.19E+02 1.69E+01 1.53E+02 8.37E+01 8.10E+01 PASS 1.05E+02 5.43E+00 1.16E+02 9.35E+01 8.10E+01 PASS 1.04E+02 5.83E+00 1.16E+02 9.17E+01 8.10E+01 PASS 1.10E+02 1.38E+01 1.38E+02 8.11E+01 8.10E+01 PASS 1.08E+02 1.08E+01 1.30E+02 8.53E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 240 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 4:1 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.118. Plot of Channel Separation @5V 4:1 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 241 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.118. Raw data for Channel Separation @5V 4:1 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 4:1 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.05E+02 9.88E+01 1.01E+02 1.09E+02 1.13E+02 1.28E+02 1.02E+02 1.01E+02 1.05E+02 9.96E+01 1.02E+02 1.09E+02 10 9.84E+01 1.12E+02 1.09E+02 1.07E+02 1.10E+02 9.92E+01 1.02E+02 1.04E+02 1.11E+02 1.03E+02 1.12E+02 1.09E+02 20 1.10E+02 1.01E+02 1.02E+02 1.05E+02 1.15E+02 1.08E+02 1.14E+02 1.05E+02 1.32E+02 9.37E+01 1.19E+02 1.24E+02 30 9.83E+01 9.99E+01 1.10E+02 1.17E+02 1.03E+02 1.05E+02 1.13E+02 1.20E+02 1.06E+02 1.07E+02 1.17E+02 1.07E+02 40 1.09E+02 1.03E+02 1.15E+02 9.69E+01 1.22E+02 9.71E+01 1.07E+02 1.07E+02 1.06E+02 9.81E+01 1.01E+02 1.14E+02 50 1.06E+02 1.03E+02 1.00E+02 1.19E+02 1.13E+02 1.12E+02 1.01E+02 9.63E+01 1.07E+02 1.05E+02 1.29E+02 1.12E+02 60 1.02E+02 9.91E+01 1.06E+02 1.13E+02 9.64E+01 1.12E+02 9.79E+01 1.16E+02 9.90E+01 9.06E+01 1.02E+02 1.13E+02 70 1.11E+02 1.02E+02 9.92E+01 1.06E+02 1.10E+02 1.04E+02 1.08E+02 1.09E+02 1.00E+02 1.01E+02 1.24E+02 1.15E+02 75 9.72E+01 1.02E+02 1.15E+02 1.25E+02 1.10E+02 9.31E+01 1.01E+02 1.09E+02 9.55E+01 1.13E+02 9.76E+01 1.22E+02 100 9.78E+01 1.05E+02 9.47E+01 9.85E+01 1.01E+02 1.17E+02 1.03E+02 1.06E+02 1.05E+02 1.06E+02 9.76E+01 1.14E+02 200 1.12E+02 1.14E+02 1.01E+02 1.06E+02 1.01E+02 1.02E+02 1.28E+02 1.01E+02 1.06E+02 1.05E+02 1.15E+02 9.73E+01 1.06E+02 8.86E+00 1.24E+02 8.79E+01 8.10E+01 PASS 1.06E+02 4.97E+00 1.16E+02 9.52E+01 8.10E+01 PASS 1.08E+02 1.02E+01 1.30E+02 8.73E+01 8.10E+01 PASS 1.08E+02 7.09E+00 1.22E+02 9.31E+01 8.10E+01 PASS 1.06E+02 7.97E+00 1.23E+02 8.96E+01 8.10E+01 PASS 1.06E+02 6.77E+00 1.20E+02 9.21E+01 8.10E+01 PASS 1.03E+02 8.22E+00 1.20E+02 8.61E+01 8.10E+01 PASS 1.05E+02 4.39E+00 1.14E+02 9.59E+01 8.10E+01 PASS 1.06E+02 1.00E+01 1.27E+02 8.54E+01 8.10E+01 PASS 1.03E+02 6.16E+00 1.16E+02 9.07E+01 8.10E+01 PASS 1.08E+02 8.47E+00 1.25E+02 9.01E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 242 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 4:2 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.119. Plot of Channel Separation @5V 4:2 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 243 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.119. Raw data for Channel Separation @5V 4:2 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 4:2 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.06E+02 1.25E+02 1.15E+02 1.02E+02 1.04E+02 1.07E+02 1.00E+02 1.09E+02 1.02E+02 1.07E+02 1.04E+02 1.06E+02 10 1.04E+02 1.03E+02 1.09E+02 1.26E+02 1.20E+02 1.19E+02 1.07E+02 1.02E+02 1.03E+02 1.15E+02 1.00E+02 1.00E+02 20 1.08E+02 1.05E+02 1.16E+02 1.20E+02 1.04E+02 1.06E+02 1.03E+02 1.13E+02 1.24E+02 1.16E+02 1.13E+02 1.17E+02 30 1.03E+02 1.08E+02 1.03E+02 1.03E+02 1.18E+02 9.45E+01 1.01E+02 1.05E+02 1.08E+02 1.09E+02 1.04E+02 1.01E+02 40 1.04E+02 1.08E+02 9.68E+01 1.06E+02 1.23E+02 9.40E+01 1.05E+02 1.18E+02 1.00E+02 1.04E+02 1.05E+02 1.04E+02 50 1.13E+02 1.09E+02 1.43E+02 1.05E+02 1.24E+02 1.07E+02 1.11E+02 1.08E+02 9.98E+01 1.05E+02 1.15E+02 1.20E+02 60 1.67E+02 9.78E+01 1.03E+02 1.22E+02 1.12E+02 9.54E+01 1.04E+02 1.11E+02 1.00E+02 1.05E+02 1.12E+02 1.14E+02 70 1.05E+02 1.13E+02 9.98E+01 1.02E+02 1.01E+02 1.03E+02 1.08E+02 1.14E+02 1.15E+02 9.84E+01 1.05E+02 1.02E+02 75 1.14E+02 9.68E+01 1.10E+02 9.98E+01 1.13E+02 1.26E+02 1.03E+02 1.02E+02 1.12E+02 1.16E+02 1.06E+02 1.16E+02 100 1.04E+02 1.09E+02 1.06E+02 1.01E+02 9.47E+01 9.91E+01 1.13E+02 1.11E+02 1.05E+02 1.06E+02 1.04E+02 9.90E+01 200 9.44E+01 9.98E+01 1.04E+02 1.05E+02 1.08E+02 1.17E+02 1.17E+02 1.11E+02 9.51E+01 1.01E+02 1.01E+02 1.23E+02 1.08E+02 7.40E+00 1.23E+02 9.25E+01 8.10E+01 PASS 1.11E+02 8.65E+00 1.29E+02 9.28E+01 8.10E+01 PASS 1.12E+02 7.24E+00 1.26E+02 9.66E+01 8.10E+01 PASS 1.05E+02 6.17E+00 1.18E+02 9.26E+01 8.10E+01 PASS 1.06E+02 8.81E+00 1.24E+02 8.75E+01 8.10E+01 PASS 1.12E+02 1.25E+01 1.38E+02 8.66E+01 8.10E+01 PASS 1.12E+02 2.09E+01 1.55E+02 6.86E+01 8.10E+01 PASS 1.06E+02 6.11E+00 1.18E+02 9.33E+01 8.10E+01 PASS 1.09E+02 8.77E+00 1.27E+02 9.11E+01 8.10E+01 PASS 1.05E+02 5.53E+00 1.16E+02 9.34E+01 8.10E+01 PASS 1.05E+02 8.09E+00 1.22E+02 8.86E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 244 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Channel Separation @5V 4:3 (dB) 1.20E+02 1.00E+02 8.00E+01 6.00E+01 4.00E+01 2.00E+01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.120. Plot of Channel Separation @5V 4:3 (dB) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 245 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.120. Raw data for Channel Separation @5V 4:3 (dB) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Channel Separation @5V 4:3 (dB) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 1.10E+02 1.19E+02 1.26E+02 9.75E+01 1.09E+02 1.00E+02 1.24E+02 1.22E+02 1.11E+02 1.05E+02 1.27E+02 1.35E+02 10 1.08E+02 1.25E+02 9.97E+01 1.04E+02 1.03E+02 1.33E+02 1.01E+02 9.88E+01 1.03E+02 9.82E+01 1.09E+02 9.73E+01 20 9.92E+01 1.16E+02 1.01E+02 1.10E+02 1.04E+02 1.23E+02 9.74E+01 1.03E+02 1.05E+02 1.04E+02 1.17E+02 1.29E+02 30 1.05E+02 1.09E+02 1.04E+02 1.09E+02 1.41E+02 9.77E+01 1.09E+02 1.01E+02 1.38E+02 1.08E+02 1.15E+02 1.03E+02 40 9.91E+01 9.71E+01 1.07E+02 9.88E+01 1.03E+02 1.03E+02 1.08E+02 1.06E+02 1.17E+02 1.04E+02 1.15E+02 1.04E+02 50 1.07E+02 1.01E+02 1.03E+02 9.77E+01 1.13E+02 1.03E+02 1.03E+02 1.08E+02 1.10E+02 1.13E+02 1.20E+02 1.41E+02 60 1.07E+02 1.00E+02 1.08E+02 9.42E+01 1.08E+02 1.01E+02 1.28E+02 1.15E+02 1.13E+02 9.33E+01 1.08E+02 9.83E+01 70 1.13E+02 1.05E+02 1.03E+02 1.18E+02 1.09E+02 1.11E+02 1.02E+02 1.34E+02 1.10E+02 1.12E+02 1.17E+02 1.15E+02 75 1.13E+02 9.66E+01 1.05E+02 1.13E+02 1.07E+02 1.07E+02 9.78E+01 1.15E+02 1.02E+02 1.01E+02 1.02E+02 9.88E+01 100 1.01E+02 1.02E+02 1.04E+02 9.96E+01 8.91E+01 1.09E+02 1.16E+02 1.10E+02 1.08E+02 1.07E+02 1.05E+02 1.02E+02 200 9.89E+01 9.19E+01 1.05E+02 1.46E+02 1.04E+02 1.02E+02 1.12E+02 1.06E+02 1.04E+02 1.29E+02 1.12E+02 1.12E+02 1.12E+02 9.86E+00 1.32E+02 9.17E+01 8.10E+01 PASS 1.07E+02 1.20E+01 1.32E+02 8.25E+01 8.10E+01 PASS 1.06E+02 7.94E+00 1.23E+02 8.98E+01 8.10E+01 PASS 1.12E+02 1.51E+01 1.43E+02 8.11E+01 8.10E+01 PASS 1.04E+02 5.76E+00 1.16E+02 9.24E+01 8.10E+01 PASS 1.06E+02 5.15E+00 1.16E+02 9.52E+01 8.10E+01 PASS 1.07E+02 1.05E+01 1.28E+02 8.51E+01 8.10E+01 PASS 1.12E+02 9.44E+00 1.31E+02 9.20E+01 8.10E+01 PASS 1.06E+02 6.37E+00 1.19E+02 9.25E+01 8.10E+01 PASS 1.04E+02 7.28E+00 1.19E+02 8.94E+01 8.10E+01 PASS 1.10E+02 1.58E+01 1.43E+02 7.72E+01 8.10E+01 PASS An ISO 9001:2008 and DSCC Certified Company 246 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=500 #1 (V) 4.20E+00 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.121. Plot of Output Voltage Swing High @5V RL=500 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 247 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.121. Raw data for Output Voltage Swing High @5V RL=500 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=500 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.11E+00 4.11E+00 4.12E+00 4.12E+00 4.11E+00 4.11E+00 4.11E+00 4.12E+00 4.11E+00 4.11E+00 4.11E+00 4.12E+00 10 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 20 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 30 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 40 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 50 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 60 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 70 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 75 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 100 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 200 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 2.85E-03 4.12E+00 4.11E+00 3.90E+00 PASS 4.11E+00 3.35E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.34E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.14E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.69E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.46E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.55E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.25E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.62E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.22E-03 4.11E+00 4.10E+00 3.70E+00 PASS 4.10E+00 2.08E-03 4.10E+00 4.09E+00 3.60E+00 PASS An ISO 9001:2008 and DSCC Certified Company 248 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=500 #2 (V) 4.20E+00 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.122. Plot of Output Voltage Swing High @5V RL=500 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 249 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.122. Raw data for Output Voltage Swing High @5V RL=500 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=500 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 10 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 20 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 30 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 40 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 50 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 60 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 70 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 75 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 100 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 200 4.09E+00 4.10E+00 4.10E+00 4.11E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 2.69E-03 4.12E+00 4.11E+00 3.90E+00 PASS 4.11E+00 3.14E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.41E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.24E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.03E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.91E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.78E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.88E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.98E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.78E-03 4.11E+00 4.10E+00 3.70E+00 PASS 4.10E+00 2.82E-03 4.11E+00 4.09E+00 3.60E+00 PASS An ISO 9001:2008 and DSCC Certified Company 250 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=500 #3 (V) 4.20E+00 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.123. Plot of Output Voltage Swing High @5V RL=500 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 251 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.123. Raw data for Output Voltage Swing High @5V RL=500 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=500 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.11E+00 4.11E+00 4.11E+00 4.12E+00 4.11E+00 4.11E+00 4.12E+00 4.11E+00 4.12E+00 4.12E+00 4.11E+00 4.11E+00 10 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 20 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 30 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 40 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 50 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 60 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 70 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 75 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 100 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 200 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 2.41E-03 4.12E+00 4.11E+00 3.90E+00 PASS 4.11E+00 3.33E-03 4.12E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.07E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.03E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.86E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.91E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.69E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.41E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.40E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.41E-03 4.11E+00 4.10E+00 3.70E+00 PASS 4.10E+00 2.46E-03 4.10E+00 4.09E+00 3.60E+00 PASS An ISO 9001:2008 and DSCC Certified Company 252 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=500 #4 (V) 4.20E+00 4.10E+00 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.124. Plot of Output Voltage Swing High @5V RL=500 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 253 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.124. Raw data for Output Voltage Swing High @5V RL=500 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=500 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.12E+00 4.11E+00 4.11E+00 4.11E+00 4.12E+00 10 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 20 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 30 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 40 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 50 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 60 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 70 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 75 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 100 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 4.10E+00 4.11E+00 4.11E+00 200 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.10E+00 4.11E+00 4.11E+00 4.11E+00 2.49E-03 4.12E+00 4.11E+00 3.90E+00 PASS 4.11E+00 2.88E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.12E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 3.16E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.99E-03 4.11E+00 4.10E+00 3.90E+00 PASS 4.11E+00 2.62E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.69E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.45E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.40E-03 4.11E+00 4.10E+00 3.80E+00 PASS 4.11E+00 2.54E-03 4.11E+00 4.10E+00 3.70E+00 PASS 4.10E+00 2.91E-03 4.10E+00 4.09E+00 3.60E+00 PASS An ISO 9001:2008 and DSCC Certified Company 254 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=100 #1 (V) 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.125. Plot of Output Voltage Swing High @5V RL=100 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 255 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.125. Raw data for Output Voltage Swing High @5V RL=100 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=100 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 10 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 20 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 30 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 40 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 50 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 60 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 70 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 75 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 100 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 200 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 2.88E-03 3.94E+00 3.93E+00 3.70E+00 PASS 3.93E+00 2.96E-03 3.93E+00 3.92E+00 3.70E+00 PASS 3.93E+00 3.06E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.03E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 2.72E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 2.79E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.62E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.62E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.83E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.58E-03 3.93E+00 3.92E+00 3.45E+00 PASS 3.92E+00 2.32E-03 3.93E+00 3.92E+00 3.40E+00 PASS An ISO 9001:2008 and DSCC Certified Company 256 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=100 #2 (V) 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.126. Plot of Output Voltage Swing High @5V RL=100 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 257 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.126. Raw data for Output Voltage Swing High @5V RL=100 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=100 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 10 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 20 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 30 3.92E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 40 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 50 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 60 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 70 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 75 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 100 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 200 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 2.84E-03 3.94E+00 3.93E+00 3.70E+00 PASS 3.93E+00 3.14E-03 3.93E+00 3.92E+00 3.70E+00 PASS 3.93E+00 3.24E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.51E-03 3.94E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.39E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.13E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.03E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.25E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.19E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.30E-03 3.93E+00 3.92E+00 3.45E+00 PASS 3.92E+00 3.28E-03 3.93E+00 3.91E+00 3.40E+00 PASS An ISO 9001:2008 and DSCC Certified Company 258 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=100 #3 (V) 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.127. Plot of Output Voltage Swing High @5V RL=100 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 259 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.127. Raw data for Output Voltage Swing High @5V RL=100 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=100 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 10 3.92E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 20 3.92E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 30 3.92E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 40 3.92E+00 3.93E+00 3.93E+00 3.94E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 50 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 60 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 70 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 75 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 100 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 200 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.53E-03 3.94E+00 3.93E+00 3.70E+00 PASS 3.93E+00 3.68E-03 3.94E+00 3.92E+00 3.70E+00 PASS 3.93E+00 3.77E-03 3.94E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.57E-03 3.94E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.41E-03 3.94E+00 3.92E+00 3.65E+00 PASS 3.93E+00 3.27E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.11E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.35E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.02E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 3.03E-03 3.93E+00 3.92E+00 3.45E+00 PASS 3.92E+00 2.81E-03 3.93E+00 3.92E+00 3.40E+00 PASS An ISO 9001:2008 and DSCC Certified Company 260 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Output Voltage Swing High @5V RL=100 #4 (V) 4.00E+00 3.90E+00 3.80E+00 3.70E+00 3.60E+00 3.50E+00 3.40E+00 3.30E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.128. Plot of Output Voltage Swing High @5V RL=100 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 261 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.128. Raw data for Output Voltage Swing High @5V RL=100 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing High @5V RL=100 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 10 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 20 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 30 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 40 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 50 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 60 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 70 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 75 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 100 3.92E+00 3.93E+00 3.93E+00 3.93E+00 3.93E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.92E+00 3.93E+00 3.93E+00 200 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.92E+00 3.93E+00 3.93E+00 3.93E+00 1.79E-03 3.93E+00 3.93E+00 3.70E+00 PASS 3.93E+00 1.75E-03 3.93E+00 3.92E+00 3.70E+00 PASS 3.93E+00 2.15E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 1.96E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 2.17E-03 3.93E+00 3.92E+00 3.65E+00 PASS 3.93E+00 2.11E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.16E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.16E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.16E-03 3.93E+00 3.92E+00 3.55E+00 PASS 3.93E+00 2.05E-03 3.93E+00 3.92E+00 3.45E+00 PASS 3.92E+00 2.21E-03 3.92E+00 3.92E+00 3.40E+00 PASS An ISO 9001:2008 and DSCC Certified Company 262 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=500 #1 (V) 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.129. Plot of Output Voltage Swing Low @5V RL=500 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 263 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.129. Raw data for Output Voltage Swing Low @5V RL=500 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=500 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 8.90E-01 8.90E-01 8.87E-01 8.86E-01 8.86E-01 8.89E-01 8.89E-01 8.86E-01 8.86E-01 8.90E-01 8.87E-01 8.92E-01 10 8.94E-01 8.96E-01 8.94E-01 8.90E-01 8.93E-01 8.96E-01 8.95E-01 8.93E-01 8.93E-01 8.96E-01 8.89E-01 8.95E-01 20 8.96E-01 8.99E-01 8.97E-01 8.92E-01 8.95E-01 8.99E-01 8.97E-01 8.96E-01 8.96E-01 8.99E-01 8.89E-01 8.95E-01 30 8.98E-01 9.01E-01 8.98E-01 8.92E-01 8.96E-01 8.99E-01 8.99E-01 8.97E-01 8.98E-01 9.01E-01 8.89E-01 8.94E-01 40 8.99E-01 9.01E-01 9.00E-01 8.94E-01 8.96E-01 9.00E-01 8.99E-01 8.98E-01 8.99E-01 9.02E-01 8.89E-01 8.94E-01 50 8.99E-01 9.02E-01 9.00E-01 8.96E-01 8.96E-01 9.01E-01 9.00E-01 8.99E-01 8.99E-01 9.04E-01 8.89E-01 8.94E-01 60 9.00E-01 9.03E-01 9.01E-01 8.96E-01 8.97E-01 9.01E-01 9.00E-01 9.00E-01 9.00E-01 9.04E-01 8.89E-01 8.94E-01 70 9.00E-01 9.03E-01 9.02E-01 8.98E-01 8.97E-01 9.02E-01 9.00E-01 9.00E-01 9.01E-01 9.06E-01 8.88E-01 8.94E-01 75 9.01E-01 9.04E-01 9.02E-01 8.99E-01 8.97E-01 9.02E-01 9.01E-01 9.00E-01 9.01E-01 9.06E-01 8.89E-01 8.94E-01 100 9.02E-01 9.06E-01 9.05E-01 9.01E-01 8.99E-01 9.03E-01 9.03E-01 9.03E-01 9.04E-01 9.08E-01 8.89E-01 8.94E-01 200 9.04E-01 9.10E-01 9.10E-01 9.07E-01 9.03E-01 9.06E-01 9.06E-01 9.08E-01 9.11E-01 9.13E-01 8.88E-01 8.93E-01 8.88E-01 1.85E-03 8.92E-01 8.84E-01 1.10E+00 PASS 8.94E-01 1.89E-03 8.98E-01 8.90E-01 1.10E+00 PASS 8.97E-01 2.17E-03 9.01E-01 8.92E-01 1.10E+00 PASS 8.98E-01 2.60E-03 9.03E-01 8.93E-01 1.10E+00 PASS 8.99E-01 2.35E-03 9.04E-01 8.94E-01 1.10E+00 PASS 9.00E-01 2.46E-03 9.05E-01 8.95E-01 1.15E+00 PASS 9.00E-01 2.39E-03 9.05E-01 8.95E-01 1.15E+00 PASS 9.01E-01 2.56E-03 9.06E-01 8.96E-01 1.15E+00 PASS 9.01E-01 2.50E-03 9.06E-01 8.96E-01 1.15E+00 PASS 9.03E-01 2.55E-03 9.09E-01 8.98E-01 1.20E+00 PASS 9.08E-01 3.19E-03 9.14E-01 9.01E-01 1.30E+00 PASS An ISO 9001:2008 and DSCC Certified Company 264 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=500 #2 (V) 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.130. Plot of Output Voltage Swing Low @5V RL=500 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 265 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.130. Raw data for Output Voltage Swing Low @5V RL=500 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=500 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 8.92E-01 8.92E-01 8.88E-01 8.86E-01 8.89E-01 8.90E-01 8.89E-01 8.87E-01 8.92E-01 8.86E-01 8.88E-01 8.92E-01 10 8.97E-01 8.98E-01 8.93E-01 8.89E-01 8.95E-01 8.97E-01 8.96E-01 8.93E-01 8.97E-01 8.92E-01 8.91E-01 8.94E-01 20 9.00E-01 9.00E-01 8.97E-01 8.91E-01 8.97E-01 8.99E-01 8.98E-01 8.97E-01 9.00E-01 8.94E-01 8.91E-01 8.94E-01 30 9.01E-01 9.01E-01 8.98E-01 8.93E-01 8.99E-01 9.02E-01 9.00E-01 8.98E-01 9.00E-01 8.95E-01 8.90E-01 8.94E-01 40 9.01E-01 9.01E-01 8.99E-01 8.94E-01 9.00E-01 9.03E-01 9.01E-01 8.99E-01 9.00E-01 8.96E-01 8.90E-01 8.94E-01 50 9.02E-01 9.02E-01 9.00E-01 8.95E-01 9.01E-01 9.04E-01 9.01E-01 8.99E-01 9.01E-01 8.97E-01 8.90E-01 8.94E-01 60 9.02E-01 9.02E-01 9.00E-01 8.97E-01 9.02E-01 9.04E-01 9.02E-01 9.00E-01 9.00E-01 8.97E-01 8.90E-01 8.93E-01 70 9.03E-01 9.03E-01 9.01E-01 8.98E-01 9.03E-01 9.05E-01 9.02E-01 9.01E-01 9.01E-01 8.97E-01 8.90E-01 8.93E-01 75 9.02E-01 9.03E-01 9.01E-01 8.99E-01 9.03E-01 9.06E-01 9.03E-01 9.02E-01 9.02E-01 8.97E-01 8.90E-01 8.94E-01 100 9.04E-01 9.05E-01 9.04E-01 9.02E-01 9.05E-01 9.08E-01 9.05E-01 9.03E-01 9.03E-01 8.98E-01 8.90E-01 8.93E-01 200 9.06E-01 9.12E-01 9.09E-01 9.10E-01 9.11E-01 9.13E-01 9.11E-01 9.10E-01 9.09E-01 9.02E-01 8.90E-01 8.93E-01 8.89E-01 2.38E-03 8.94E-01 8.84E-01 1.10E+00 PASS 8.95E-01 2.87E-03 9.01E-01 8.89E-01 1.10E+00 PASS 8.97E-01 2.91E-03 9.03E-01 8.91E-01 1.10E+00 PASS 8.99E-01 2.83E-03 9.05E-01 8.93E-01 1.10E+00 PASS 8.99E-01 2.63E-03 9.05E-01 8.94E-01 1.10E+00 PASS 9.00E-01 2.62E-03 9.06E-01 8.95E-01 1.15E+00 PASS 9.01E-01 2.27E-03 9.05E-01 8.96E-01 1.15E+00 PASS 9.01E-01 2.41E-03 9.06E-01 8.96E-01 1.15E+00 PASS 9.02E-01 2.44E-03 9.07E-01 8.97E-01 1.15E+00 PASS 9.04E-01 2.58E-03 9.09E-01 8.98E-01 1.20E+00 PASS 9.09E-01 3.20E-03 9.16E-01 9.03E-01 1.30E+00 PASS An ISO 9001:2008 and DSCC Certified Company 266 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=500 #3 (V) 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.131. Plot of Output Voltage Swing Low @5V RL=500 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 267 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.131. Raw data for Output Voltage Swing Low @5V RL=500 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=500 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 8.92E-01 8.90E-01 8.88E-01 8.85E-01 8.89E-01 8.91E-01 8.86E-01 8.88E-01 8.87E-01 8.85E-01 8.88E-01 8.92E-01 10 8.98E-01 8.97E-01 8.95E-01 8.89E-01 8.96E-01 8.97E-01 8.93E-01 8.94E-01 8.93E-01 8.91E-01 8.90E-01 8.95E-01 20 9.00E-01 9.00E-01 8.98E-01 8.91E-01 8.98E-01 8.99E-01 8.96E-01 8.97E-01 8.96E-01 8.93E-01 8.90E-01 8.94E-01 30 9.00E-01 9.01E-01 8.99E-01 8.92E-01 9.00E-01 9.01E-01 8.97E-01 8.98E-01 8.97E-01 8.95E-01 8.90E-01 8.94E-01 40 9.01E-01 9.01E-01 9.00E-01 8.94E-01 9.00E-01 9.01E-01 8.98E-01 8.98E-01 8.98E-01 8.95E-01 8.90E-01 8.94E-01 50 9.01E-01 9.03E-01 9.02E-01 8.95E-01 9.02E-01 9.02E-01 8.99E-01 8.99E-01 8.98E-01 8.96E-01 8.90E-01 8.94E-01 60 9.01E-01 9.03E-01 9.02E-01 8.96E-01 9.02E-01 9.02E-01 8.99E-01 8.98E-01 8.98E-01 8.96E-01 8.89E-01 8.94E-01 70 9.01E-01 9.04E-01 9.02E-01 8.98E-01 9.03E-01 9.02E-01 8.99E-01 8.98E-01 8.99E-01 8.96E-01 8.89E-01 8.93E-01 75 9.02E-01 9.04E-01 9.03E-01 8.99E-01 9.04E-01 9.03E-01 9.00E-01 8.99E-01 8.99E-01 8.97E-01 8.89E-01 8.93E-01 100 9.04E-01 9.07E-01 9.05E-01 9.02E-01 9.06E-01 9.04E-01 9.01E-01 9.00E-01 9.01E-01 8.98E-01 8.90E-01 8.93E-01 200 9.08E-01 9.12E-01 9.11E-01 9.09E-01 9.12E-01 9.07E-01 9.07E-01 9.02E-01 9.04E-01 9.03E-01 8.89E-01 8.94E-01 8.88E-01 2.42E-03 8.93E-01 8.83E-01 1.10E+00 PASS 8.94E-01 2.87E-03 9.00E-01 8.88E-01 1.10E+00 PASS 8.97E-01 2.94E-03 9.03E-01 8.91E-01 1.10E+00 PASS 8.98E-01 2.87E-03 9.04E-01 8.92E-01 1.10E+00 PASS 8.99E-01 2.50E-03 9.04E-01 8.93E-01 1.10E+00 PASS 9.00E-01 2.75E-03 9.05E-01 8.94E-01 1.15E+00 PASS 9.00E-01 2.63E-03 9.05E-01 8.94E-01 1.15E+00 PASS 9.00E-01 2.57E-03 9.06E-01 8.95E-01 1.15E+00 PASS 9.01E-01 2.49E-03 9.06E-01 8.96E-01 1.15E+00 PASS 9.03E-01 2.86E-03 9.09E-01 8.97E-01 1.20E+00 PASS 9.08E-01 3.63E-03 9.15E-01 9.00E-01 1.30E+00 PASS An ISO 9001:2008 and DSCC Certified Company 268 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=500 #4 (V) 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.132. Plot of Output Voltage Swing Low @5V RL=500 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 269 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.132. Raw data for Output Voltage Swing Low @5V RL=500 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=500 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 8.94E-01 8.89E-01 8.87E-01 8.85E-01 8.87E-01 8.90E-01 8.90E-01 8.88E-01 8.87E-01 8.92E-01 8.88E-01 8.90E-01 10 8.98E-01 8.95E-01 8.93E-01 8.88E-01 8.92E-01 8.96E-01 8.97E-01 8.95E-01 8.93E-01 8.97E-01 8.90E-01 8.92E-01 20 9.00E-01 8.98E-01 8.96E-01 8.90E-01 8.95E-01 8.98E-01 9.00E-01 8.98E-01 8.96E-01 9.02E-01 8.90E-01 8.92E-01 30 9.02E-01 8.98E-01 8.97E-01 8.90E-01 8.97E-01 8.99E-01 9.01E-01 9.00E-01 8.98E-01 9.04E-01 8.90E-01 8.92E-01 40 9.03E-01 8.99E-01 8.98E-01 8.92E-01 8.98E-01 9.00E-01 9.02E-01 9.01E-01 8.99E-01 9.04E-01 8.90E-01 8.92E-01 50 9.04E-01 9.00E-01 8.98E-01 8.93E-01 8.98E-01 9.01E-01 9.02E-01 9.02E-01 9.00E-01 9.04E-01 8.89E-01 8.91E-01 60 9.04E-01 9.00E-01 8.98E-01 8.94E-01 8.99E-01 9.01E-01 9.03E-01 9.03E-01 9.01E-01 9.06E-01 8.89E-01 8.91E-01 70 9.04E-01 9.01E-01 8.99E-01 8.95E-01 8.99E-01 9.01E-01 9.04E-01 9.04E-01 9.01E-01 9.06E-01 8.89E-01 8.91E-01 75 9.05E-01 9.02E-01 9.00E-01 8.96E-01 9.00E-01 9.02E-01 9.05E-01 9.05E-01 9.01E-01 9.07E-01 8.89E-01 8.91E-01 100 9.06E-01 9.03E-01 9.02E-01 8.99E-01 9.01E-01 9.03E-01 9.06E-01 9.07E-01 9.04E-01 9.09E-01 8.89E-01 8.91E-01 200 9.08E-01 9.06E-01 9.05E-01 9.03E-01 9.07E-01 9.06E-01 9.11E-01 9.16E-01 9.10E-01 9.14E-01 8.89E-01 8.91E-01 8.89E-01 2.69E-03 8.94E-01 8.83E-01 1.10E+00 PASS 8.94E-01 2.99E-03 9.01E-01 8.88E-01 1.10E+00 PASS 8.97E-01 3.33E-03 9.04E-01 8.90E-01 1.10E+00 PASS 8.99E-01 3.78E-03 9.06E-01 8.91E-01 1.10E+00 PASS 9.00E-01 3.37E-03 9.07E-01 8.93E-01 1.10E+00 PASS 9.00E-01 3.29E-03 9.07E-01 8.93E-01 1.15E+00 PASS 9.01E-01 3.41E-03 9.08E-01 8.94E-01 1.15E+00 PASS 9.01E-01 3.24E-03 9.08E-01 8.95E-01 1.15E+00 PASS 9.02E-01 3.27E-03 9.09E-01 8.96E-01 1.15E+00 PASS 9.04E-01 3.02E-03 9.10E-01 8.98E-01 1.20E+00 PASS 9.09E-01 4.12E-03 9.17E-01 9.00E-01 1.30E+00 PASS An ISO 9001:2008 and DSCC Certified Company 270 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=100 #1 (V) 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.133. Plot of Output Voltage Swing Low @5V RL=100 #1 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 271 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.133. Raw data for Output Voltage Swing Low @5V RL=100 #1 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=100 #1 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 1.08E+00 1.08E+00 1.07E+00 1.07E+00 1.07E+00 1.08E+00 1.08E+00 1.07E+00 1.07E+00 1.08E+00 1.07E+00 1.08E+00 10 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 20 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 30 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 40 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 50 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 60 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 70 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 75 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 100 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.09E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 200 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.08E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.07E+00 1.08E+00 1.07E+00 2.45E-03 1.08E+00 1.07E+00 1.30E+00 PASS 1.08E+00 3.47E-03 1.09E+00 1.07E+00 1.30E+00 PASS 1.08E+00 4.14E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.17E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.02E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 3.60E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.47E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.20E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.37E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.27E-03 1.09E+00 1.08E+00 1.45E+00 PASS 1.09E+00 3.52E-03 1.10E+00 1.08E+00 1.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 272 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=100 #2 (V) 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.134. Plot of Output Voltage Swing Low @5V RL=100 #2 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 273 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.134. Raw data for Output Voltage Swing Low @5V RL=100 #2 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=100 #2 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 1.08E+00 1.08E+00 1.07E+00 1.07E+00 1.07E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 10 1.09E+00 1.09E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.07E+00 1.08E+00 1.08E+00 20 1.09E+00 1.09E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 30 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 40 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 50 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 60 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 70 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 75 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 100 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 200 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 4.50E-03 1.08E+00 1.07E+00 1.30E+00 PASS 1.08E+00 5.30E-03 1.09E+00 1.07E+00 1.30E+00 PASS 1.08E+00 5.33E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 5.13E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.79E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.42E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 4.24E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.79E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 4.10E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.63E-03 1.09E+00 1.07E+00 1.45E+00 PASS 1.09E+00 3.75E-03 1.10E+00 1.08E+00 1.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 274 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=100 #3 (V) 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.135. Plot of Output Voltage Swing Low @5V RL=100 #3 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 275 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.135. Raw data for Output Voltage Swing Low @5V RL=100 #3 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=100 #3 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 1.08E+00 1.07E+00 1.07E+00 1.07E+00 1.07E+00 1.08E+00 1.07E+00 1.07E+00 1.07E+00 1.07E+00 1.07E+00 1.08E+00 10 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 20 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 30 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 40 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 50 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 60 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 70 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.07E+00 1.08E+00 75 1.09E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 100 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 200 1.09E+00 1.09E+00 1.09E+00 1.08E+00 1.09E+00 1.09E+00 1.09E+00 1.08E+00 1.09E+00 1.08E+00 1.07E+00 1.08E+00 1.07E+00 3.77E-03 1.08E+00 1.07E+00 1.30E+00 PASS 1.08E+00 5.28E-03 1.09E+00 1.07E+00 1.30E+00 PASS 1.08E+00 5.42E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 5.52E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.80E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.48E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 4.21E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 4.01E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.89E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.98E-03 1.09E+00 1.07E+00 1.45E+00 PASS 1.09E+00 4.01E-03 1.10E+00 1.08E+00 1.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 276 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Output Voltage Swing Low @5V RL=100 #4 (V) 1.60E+00 1.40E+00 1.20E+00 1.00E+00 8.00E-01 6.00E-01 4.00E-01 2.00E-01 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.136. Plot of Output Voltage Swing Low @5V RL=100 #4 (V) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 277 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.136. Raw data for Output Voltage Swing Low @5V RL=100 #4 (V) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Output Voltage Swing Low @5V RL=100 #4 (V) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 1.08E+00 1.08E+00 1.07E+00 1.07E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 10 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.07E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 20 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 30 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.09E+00 1.08E+00 1.08E+00 1.09E+00 1.07E+00 1.08E+00 40 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.09E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 50 1.08E+00 1.08E+00 1.08E+00 1.07E+00 1.08E+00 1.09E+00 1.09E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 60 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.09E+00 1.08E+00 1.08E+00 1.09E+00 1.07E+00 1.08E+00 70 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 1.09E+00 1.07E+00 1.08E+00 75 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.09E+00 1.08E+00 1.09E+00 1.08E+00 1.08E+00 100 1.09E+00 1.08E+00 1.08E+00 1.08E+00 1.08E+00 1.09E+00 1.09E+00 1.09E+00 1.08E+00 1.09E+00 1.07E+00 1.08E+00 200 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.09E+00 1.07E+00 1.08E+00 1.07E+00 2.54E-03 1.08E+00 1.07E+00 1.30E+00 PASS 1.08E+00 3.63E-03 1.09E+00 1.07E+00 1.30E+00 PASS 1.08E+00 4.31E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.43E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 4.24E-03 1.09E+00 1.07E+00 1.35E+00 PASS 1.08E+00 3.86E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.60E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.47E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.45E-03 1.09E+00 1.07E+00 1.40E+00 PASS 1.08E+00 3.49E-03 1.09E+00 1.08E+00 1.45E+00 PASS 1.09E+00 3.48E-03 1.10E+00 1.08E+00 1.50E+00 PASS An ISO 9001:2008 and DSCC Certified Company 278 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @5V #1 (A) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.137. Plot of Maximum Output Source Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 279 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.137. Raw data for Maximum Output Source Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.93E-02 4.02E-02 4.07E-02 4.09E-02 4.12E-02 3.95E-02 3.94E-02 3.97E-02 3.99E-02 3.94E-02 4.01E-02 4.02E-02 10 3.90E-02 3.98E-02 4.02E-02 4.06E-02 4.09E-02 3.91E-02 3.90E-02 3.94E-02 3.96E-02 3.90E-02 3.99E-02 4.00E-02 20 3.90E-02 3.97E-02 4.02E-02 4.06E-02 4.08E-02 3.91E-02 3.89E-02 3.94E-02 3.95E-02 3.90E-02 3.99E-02 4.00E-02 30 3.90E-02 3.96E-02 4.02E-02 4.06E-02 4.08E-02 3.91E-02 3.89E-02 3.94E-02 3.95E-02 3.90E-02 3.99E-02 4.00E-02 40 3.90E-02 3.96E-02 4.02E-02 4.05E-02 4.08E-02 3.90E-02 3.89E-02 3.94E-02 3.95E-02 3.90E-02 3.99E-02 4.01E-02 50 3.90E-02 3.96E-02 4.02E-02 4.05E-02 4.07E-02 3.90E-02 3.89E-02 3.93E-02 3.95E-02 3.90E-02 3.99E-02 4.01E-02 60 3.90E-02 3.96E-02 4.01E-02 4.04E-02 4.07E-02 3.90E-02 3.88E-02 3.93E-02 3.95E-02 3.90E-02 4.00E-02 4.01E-02 70 3.90E-02 3.95E-02 4.01E-02 4.02E-02 4.06E-02 3.89E-02 3.88E-02 3.92E-02 3.95E-02 3.89E-02 4.00E-02 4.01E-02 75 3.90E-02 3.95E-02 4.01E-02 4.04E-02 4.07E-02 3.89E-02 3.88E-02 3.93E-02 3.95E-02 3.89E-02 4.00E-02 4.01E-02 100 3.89E-02 3.94E-02 4.00E-02 4.01E-02 4.05E-02 3.88E-02 3.87E-02 3.91E-02 3.94E-02 3.88E-02 4.00E-02 4.01E-02 200 3.83E-02 3.88E-02 3.95E-02 3.94E-02 3.98E-02 3.83E-02 3.79E-02 3.86E-02 3.89E-02 3.83E-02 4.00E-02 4.01E-02 4.00E-02 6.99E-04 4.15E-02 3.86E-02 2.50E-02 PASS 3.97E-02 6.97E-04 4.11E-02 3.82E-02 2.50E-02 PASS 3.96E-02 6.97E-04 4.11E-02 3.82E-02 2.50E-02 PASS 3.96E-02 7.01E-04 4.11E-02 3.82E-02 2.50E-02 PASS 3.96E-02 6.86E-04 4.10E-02 3.82E-02 2.50E-02 PASS 3.96E-02 6.60E-04 4.10E-02 3.82E-02 2.50E-02 PASS 3.95E-02 6.67E-04 4.09E-02 3.82E-02 2.50E-02 PASS 3.95E-02 6.36E-04 4.08E-02 3.82E-02 2.50E-02 PASS 3.95E-02 6.71E-04 4.09E-02 3.81E-02 2.50E-02 PASS 3.94E-02 6.36E-04 4.07E-02 3.81E-02 2.50E-02 PASS 3.88E-02 6.19E-04 4.01E-02 3.75E-02 2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 280 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @5V #2 (A) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.138. Plot of Maximum Output Source Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 281 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.138. Raw data for Maximum Output Source Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.91E-02 4.00E-02 3.99E-02 4.13E-02 4.00E-02 3.93E-02 4.00E-02 4.02E-02 4.02E-02 4.11E-02 3.96E-02 3.92E-02 10 3.89E-02 3.96E-02 3.96E-02 4.11E-02 3.98E-02 3.90E-02 3.96E-02 3.99E-02 3.99E-02 4.08E-02 3.94E-02 3.90E-02 20 3.88E-02 3.96E-02 3.95E-02 4.11E-02 3.96E-02 3.90E-02 3.96E-02 3.98E-02 3.98E-02 4.07E-02 3.95E-02 3.90E-02 30 3.88E-02 3.96E-02 3.95E-02 4.11E-02 3.96E-02 3.90E-02 3.95E-02 3.97E-02 3.99E-02 4.07E-02 3.95E-02 3.90E-02 40 3.87E-02 3.95E-02 3.95E-02 4.11E-02 3.96E-02 3.90E-02 3.95E-02 3.98E-02 3.98E-02 4.07E-02 3.95E-02 3.91E-02 50 3.87E-02 3.95E-02 3.95E-02 4.11E-02 3.96E-02 3.90E-02 3.95E-02 3.97E-02 3.98E-02 4.07E-02 3.95E-02 3.90E-02 60 3.87E-02 3.95E-02 3.95E-02 4.10E-02 3.95E-02 3.90E-02 3.95E-02 3.97E-02 3.97E-02 4.06E-02 3.95E-02 3.91E-02 70 3.85E-02 3.95E-02 3.95E-02 4.10E-02 3.95E-02 3.89E-02 3.94E-02 3.96E-02 3.97E-02 4.06E-02 3.95E-02 3.91E-02 75 3.85E-02 3.95E-02 3.95E-02 4.10E-02 3.95E-02 3.89E-02 3.94E-02 3.96E-02 3.98E-02 4.06E-02 3.95E-02 3.92E-02 100 3.84E-02 3.93E-02 3.94E-02 4.08E-02 3.94E-02 3.88E-02 3.93E-02 3.95E-02 3.96E-02 4.04E-02 3.95E-02 3.91E-02 200 3.78E-02 3.88E-02 3.89E-02 4.04E-02 3.89E-02 3.84E-02 3.88E-02 3.90E-02 3.91E-02 3.98E-02 3.95E-02 3.91E-02 4.01E-02 6.83E-04 4.15E-02 3.87E-02 2.50E-02 PASS 3.98E-02 6.72E-04 4.12E-02 3.84E-02 2.50E-02 PASS 3.98E-02 6.92E-04 4.12E-02 3.83E-02 2.50E-02 PASS 3.97E-02 6.95E-04 4.12E-02 3.83E-02 2.50E-02 PASS 3.97E-02 7.17E-04 4.12E-02 3.82E-02 2.50E-02 PASS 3.97E-02 7.14E-04 4.12E-02 3.82E-02 2.50E-02 PASS 3.97E-02 6.76E-04 4.11E-02 3.83E-02 2.50E-02 PASS 3.96E-02 7.10E-04 4.11E-02 3.82E-02 2.50E-02 PASS 3.96E-02 7.13E-04 4.11E-02 3.82E-02 2.50E-02 PASS 3.95E-02 7.01E-04 4.10E-02 3.81E-02 2.50E-02 PASS 3.90E-02 6.92E-04 4.04E-02 3.76E-02 2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 282 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @5V #3 (A) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.139. Plot of Maximum Output Source Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 283 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.139. Raw data for Maximum Output Source Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.91E-02 4.02E-02 4.01E-02 4.18E-02 4.01E-02 3.94E-02 4.02E-02 4.05E-02 4.04E-02 4.13E-02 3.99E-02 3.92E-02 10 3.89E-02 3.99E-02 3.98E-02 4.15E-02 3.98E-02 3.92E-02 3.99E-02 4.00E-02 4.00E-02 4.10E-02 3.96E-02 3.90E-02 20 3.88E-02 3.97E-02 3.97E-02 4.14E-02 3.97E-02 3.92E-02 3.98E-02 4.00E-02 3.99E-02 4.10E-02 3.96E-02 3.90E-02 30 3.88E-02 3.97E-02 3.97E-02 4.14E-02 3.97E-02 3.91E-02 3.97E-02 4.00E-02 3.99E-02 4.08E-02 3.96E-02 3.90E-02 40 3.88E-02 3.98E-02 3.96E-02 4.13E-02 3.96E-02 3.91E-02 3.98E-02 4.00E-02 3.99E-02 4.08E-02 3.96E-02 3.90E-02 50 3.87E-02 3.97E-02 3.96E-02 4.13E-02 3.96E-02 3.91E-02 3.98E-02 4.00E-02 3.99E-02 4.08E-02 3.97E-02 3.90E-02 60 3.87E-02 3.96E-02 3.96E-02 4.12E-02 3.96E-02 3.90E-02 3.97E-02 3.99E-02 3.98E-02 4.07E-02 3.97E-02 3.90E-02 70 3.87E-02 3.96E-02 3.96E-02 4.12E-02 3.96E-02 3.90E-02 3.96E-02 3.99E-02 3.97E-02 4.07E-02 3.97E-02 3.90E-02 75 3.87E-02 3.96E-02 3.95E-02 4.12E-02 3.95E-02 3.90E-02 3.96E-02 3.99E-02 3.98E-02 4.07E-02 3.97E-02 3.91E-02 100 3.85E-02 3.95E-02 3.95E-02 4.10E-02 3.95E-02 3.88E-02 3.95E-02 3.98E-02 3.96E-02 4.05E-02 3.98E-02 3.90E-02 200 3.81E-02 3.89E-02 3.89E-02 4.04E-02 3.90E-02 3.83E-02 3.90E-02 3.92E-02 3.90E-02 3.99E-02 3.98E-02 3.90E-02 4.03E-02 7.76E-04 4.19E-02 3.87E-02 2.50E-02 PASS 4.00E-02 7.47E-04 4.15E-02 3.84E-02 2.50E-02 PASS 3.99E-02 7.78E-04 4.15E-02 3.83E-02 2.50E-02 PASS 3.99E-02 7.63E-04 4.15E-02 3.83E-02 2.50E-02 PASS 3.99E-02 7.41E-04 4.14E-02 3.83E-02 2.50E-02 PASS 3.98E-02 7.71E-04 4.14E-02 3.83E-02 2.50E-02 PASS 3.98E-02 7.40E-04 4.13E-02 3.83E-02 2.50E-02 PASS 3.98E-02 7.36E-04 4.13E-02 3.82E-02 2.50E-02 PASS 3.98E-02 7.40E-04 4.13E-02 3.82E-02 2.50E-02 PASS 3.96E-02 7.08E-04 4.11E-02 3.81E-02 2.50E-02 PASS 3.91E-02 6.68E-04 4.04E-02 3.77E-02 2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 284 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Maximum Output Source Current @5V #4 (A) 4.50E-02 4.00E-02 3.50E-02 3.00E-02 2.50E-02 2.00E-02 1.50E-02 1.00E-02 5.00E-03 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.140. Plot of Maximum Output Source Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 285 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.140. Raw data for Maximum Output Source Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Source Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 3.95E-02 4.01E-02 4.05E-02 4.06E-02 4.10E-02 3.96E-02 3.95E-02 3.97E-02 4.00E-02 3.95E-02 4.01E-02 4.04E-02 10 3.93E-02 3.98E-02 4.01E-02 4.04E-02 4.07E-02 3.93E-02 3.93E-02 3.95E-02 3.96E-02 3.92E-02 3.99E-02 4.00E-02 20 3.93E-02 3.97E-02 4.01E-02 4.04E-02 4.06E-02 3.92E-02 3.91E-02 3.95E-02 3.96E-02 3.91E-02 3.99E-02 4.01E-02 30 3.92E-02 3.97E-02 4.01E-02 4.03E-02 4.06E-02 3.91E-02 3.91E-02 3.94E-02 3.96E-02 3.91E-02 3.99E-02 4.01E-02 40 3.91E-02 3.96E-02 4.01E-02 4.02E-02 4.06E-02 3.91E-02 3.91E-02 3.94E-02 3.95E-02 3.90E-02 4.00E-02 4.01E-02 50 3.91E-02 3.96E-02 4.01E-02 4.01E-02 4.05E-02 3.90E-02 3.92E-02 3.94E-02 3.95E-02 3.90E-02 4.00E-02 4.01E-02 60 3.91E-02 3.96E-02 4.00E-02 4.01E-02 4.05E-02 3.90E-02 3.90E-02 3.94E-02 3.95E-02 3.90E-02 4.00E-02 4.01E-02 70 3.90E-02 3.95E-02 4.00E-02 4.00E-02 4.04E-02 3.89E-02 3.90E-02 3.94E-02 3.94E-02 3.89E-02 4.00E-02 4.01E-02 75 3.90E-02 3.95E-02 4.00E-02 4.00E-02 4.04E-02 3.89E-02 3.90E-02 3.94E-02 3.94E-02 3.89E-02 4.00E-02 4.01E-02 100 3.89E-02 3.94E-02 3.99E-02 3.98E-02 4.02E-02 3.88E-02 3.89E-02 3.93E-02 3.93E-02 3.88E-02 4.00E-02 4.01E-02 200 3.83E-02 3.88E-02 3.94E-02 3.90E-02 3.96E-02 3.81E-02 3.84E-02 3.89E-02 3.88E-02 3.82E-02 4.00E-02 4.02E-02 4.00E-02 5.17E-04 4.11E-02 3.89E-02 2.50E-02 PASS 3.97E-02 5.30E-04 4.08E-02 3.86E-02 2.50E-02 PASS 3.97E-02 5.31E-04 4.08E-02 3.86E-02 2.50E-02 PASS 3.96E-02 5.42E-04 4.07E-02 3.85E-02 2.50E-02 PASS 3.96E-02 5.44E-04 4.07E-02 3.85E-02 2.50E-02 PASS 3.96E-02 5.22E-04 4.06E-02 3.85E-02 2.50E-02 PASS 3.95E-02 5.26E-04 4.06E-02 3.84E-02 2.50E-02 PASS 3.95E-02 5.20E-04 4.05E-02 3.84E-02 2.50E-02 PASS 3.95E-02 5.14E-04 4.05E-02 3.84E-02 2.50E-02 PASS 3.93E-02 5.10E-04 4.04E-02 3.83E-02 2.50E-02 PASS 3.87E-02 5.18E-04 3.98E-02 3.77E-02 2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 286 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @5V #1 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.141. Plot of Maximum Output Sink Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 287 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.141. Raw data for Maximum Output Sink Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.59E-02 -3.60E-02 -3.65E-02 -3.68E-02 -3.72E-02 -3.59E-02 -3.57E-02 -3.59E-02 -3.61E-02 -3.59E-02 -3.62E-02 -3.60E-02 10 -3.56E-02 -3.53E-02 -3.59E-02 -3.69E-02 -3.67E-02 -3.51E-02 -3.51E-02 -3.52E-02 -3.54E-02 -3.54E-02 -3.60E-02 -3.59E-02 20 -3.54E-02 -3.50E-02 -3.57E-02 -3.68E-02 -3.65E-02 -3.48E-02 -3.47E-02 -3.49E-02 -3.51E-02 -3.51E-02 -3.60E-02 -3.59E-02 30 -3.52E-02 -3.50E-02 -3.56E-02 -3.68E-02 -3.65E-02 -3.49E-02 -3.46E-02 -3.48E-02 -3.51E-02 -3.50E-02 -3.61E-02 -3.59E-02 40 -3.52E-02 -3.51E-02 -3.57E-02 -3.68E-02 -3.68E-02 -3.50E-02 -3.47E-02 -3.49E-02 -3.51E-02 -3.50E-02 -3.62E-02 -3.59E-02 50 -3.53E-02 -3.53E-02 -3.59E-02 -3.68E-02 -3.69E-02 -3.51E-02 -3.48E-02 -3.51E-02 -3.53E-02 -3.51E-02 -3.63E-02 -3.61E-02 60 -3.53E-02 -3.53E-02 -3.59E-02 -3.66E-02 -3.69E-02 -3.51E-02 -3.48E-02 -3.51E-02 -3.53E-02 -3.51E-02 -3.63E-02 -3.61E-02 70 -3.52E-02 -3.52E-02 -3.58E-02 -3.63E-02 -3.68E-02 -3.50E-02 -3.47E-02 -3.49E-02 -3.52E-02 -3.48E-02 -3.62E-02 -3.60E-02 75 -3.53E-02 -3.53E-02 -3.59E-02 -3.65E-02 -3.69E-02 -3.51E-02 -3.48E-02 -3.50E-02 -3.52E-02 -3.50E-02 -3.63E-02 -3.62E-02 100 -3.51E-02 -3.50E-02 -3.57E-02 -3.60E-02 -3.66E-02 -3.49E-02 -3.46E-02 -3.47E-02 -3.50E-02 -3.46E-02 -3.62E-02 -3.60E-02 200 -3.45E-02 -3.42E-02 -3.50E-02 -3.50E-02 -3.59E-02 -3.42E-02 -3.37E-02 -3.38E-02 -3.41E-02 -3.36E-02 -3.62E-02 -3.60E-02 -3.62E-02 4.71E-04 -3.52E-02 -3.72E-02 -2.50E-02 PASS -3.56E-02 6.51E-04 -3.43E-02 -3.70E-02 -2.50E-02 PASS -3.54E-02 7.23E-04 -3.39E-02 -3.69E-02 -2.50E-02 PASS -3.53E-02 7.46E-04 -3.38E-02 -3.69E-02 -2.50E-02 PASS -3.54E-02 7.47E-04 -3.39E-02 -3.70E-02 -2.50E-02 PASS -3.56E-02 7.27E-04 -3.41E-02 -3.71E-02 -2.50E-02 PASS -3.55E-02 7.02E-04 -3.41E-02 -3.70E-02 -2.50E-02 PASS -3.54E-02 6.80E-04 -3.40E-02 -3.68E-02 -2.50E-02 PASS -3.55E-02 7.09E-04 -3.40E-02 -3.70E-02 -2.50E-02 PASS -3.52E-02 6.83E-04 -3.38E-02 -3.66E-02 -2.50E-02 PASS -3.44E-02 7.14E-04 -3.29E-02 -3.59E-02 -2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 288 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @5V #2 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.142. Plot of Maximum Output Sink Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 289 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.142. Raw data for Maximum Output Sink Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.53E-02 -3.53E-02 -3.62E-02 -3.76E-02 -3.64E-02 -3.56E-02 -3.59E-02 -3.62E-02 -3.51E-02 -3.71E-02 -3.58E-02 -3.54E-02 10 -3.46E-02 -3.48E-02 -3.57E-02 -3.76E-02 -3.60E-02 -3.52E-02 -3.53E-02 -3.57E-02 -3.50E-02 -3.68E-02 -3.57E-02 -3.54E-02 20 -3.43E-02 -3.48E-02 -3.53E-02 -3.75E-02 -3.57E-02 -3.51E-02 -3.51E-02 -3.54E-02 -3.50E-02 -3.67E-02 -3.57E-02 -3.54E-02 30 -3.43E-02 -3.50E-02 -3.52E-02 -3.75E-02 -3.56E-02 -3.48E-02 -3.51E-02 -3.54E-02 -3.51E-02 -3.66E-02 -3.58E-02 -3.54E-02 40 -3.44E-02 -3.52E-02 -3.53E-02 -3.74E-02 -3.56E-02 -3.48E-02 -3.51E-02 -3.55E-02 -3.53E-02 -3.66E-02 -3.58E-02 -3.54E-02 50 -3.45E-02 -3.54E-02 -3.54E-02 -3.75E-02 -3.57E-02 -3.50E-02 -3.53E-02 -3.57E-02 -3.55E-02 -3.68E-02 -3.59E-02 -3.56E-02 60 -3.46E-02 -3.54E-02 -3.54E-02 -3.74E-02 -3.57E-02 -3.50E-02 -3.54E-02 -3.58E-02 -3.56E-02 -3.69E-02 -3.59E-02 -3.56E-02 70 -3.45E-02 -3.53E-02 -3.54E-02 -3.71E-02 -3.56E-02 -3.48E-02 -3.53E-02 -3.56E-02 -3.54E-02 -3.68E-02 -3.58E-02 -3.55E-02 75 -3.46E-02 -3.54E-02 -3.55E-02 -3.71E-02 -3.56E-02 -3.48E-02 -3.53E-02 -3.57E-02 -3.56E-02 -3.69E-02 -3.59E-02 -3.56E-02 100 -3.44E-02 -3.52E-02 -3.53E-02 -3.68E-02 -3.54E-02 -3.46E-02 -3.52E-02 -3.56E-02 -3.54E-02 -3.68E-02 -3.58E-02 -3.55E-02 200 -3.37E-02 -3.43E-02 -3.45E-02 -3.58E-02 -3.46E-02 -3.37E-02 -3.45E-02 -3.49E-02 -3.46E-02 -3.63E-02 -3.58E-02 -3.54E-02 -3.61E-02 8.12E-04 -3.44E-02 -3.78E-02 -2.50E-02 PASS -3.57E-02 9.38E-04 -3.37E-02 -3.76E-02 -2.50E-02 PASS -3.55E-02 9.35E-04 -3.36E-02 -3.74E-02 -2.50E-02 PASS -3.55E-02 9.25E-04 -3.35E-02 -3.74E-02 -2.50E-02 PASS -3.55E-02 8.75E-04 -3.37E-02 -3.73E-02 -2.50E-02 PASS -3.57E-02 8.67E-04 -3.39E-02 -3.75E-02 -2.50E-02 PASS -3.57E-02 8.40E-04 -3.40E-02 -3.74E-02 -2.50E-02 PASS -3.56E-02 8.12E-04 -3.39E-02 -3.72E-02 -2.50E-02 PASS -3.57E-02 7.99E-04 -3.40E-02 -3.73E-02 -2.50E-02 PASS -3.55E-02 7.90E-04 -3.38E-02 -3.71E-02 -2.50E-02 PASS -3.47E-02 8.05E-04 -3.30E-02 -3.64E-02 -2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 290 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @5V #3 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.143. Plot of Maximum Output Sink Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 291 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.143. Raw data for Maximum Output Sink Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.50E-02 -3.63E-02 -3.62E-02 -3.79E-02 -3.65E-02 -3.57E-02 -3.62E-02 -3.64E-02 -3.64E-02 -3.74E-02 -3.62E-02 -3.57E-02 10 -3.42E-02 -3.56E-02 -3.56E-02 -3.80E-02 -3.59E-02 -3.53E-02 -3.54E-02 -3.59E-02 -3.58E-02 -3.69E-02 -3.62E-02 -3.56E-02 20 -3.41E-02 -3.53E-02 -3.52E-02 -3.79E-02 -3.57E-02 -3.52E-02 -3.52E-02 -3.57E-02 -3.56E-02 -3.68E-02 -3.62E-02 -3.57E-02 30 -3.42E-02 -3.53E-02 -3.52E-02 -3.79E-02 -3.56E-02 -3.51E-02 -3.51E-02 -3.56E-02 -3.56E-02 -3.68E-02 -3.62E-02 -3.57E-02 40 -3.45E-02 -3.54E-02 -3.53E-02 -3.78E-02 -3.57E-02 -3.51E-02 -3.52E-02 -3.57E-02 -3.56E-02 -3.68E-02 -3.62E-02 -3.57E-02 50 -3.46E-02 -3.56E-02 -3.55E-02 -3.79E-02 -3.58E-02 -3.53E-02 -3.53E-02 -3.58E-02 -3.58E-02 -3.70E-02 -3.63E-02 -3.58E-02 60 -3.47E-02 -3.56E-02 -3.54E-02 -3.77E-02 -3.57E-02 -3.53E-02 -3.54E-02 -3.59E-02 -3.58E-02 -3.71E-02 -3.63E-02 -3.58E-02 70 -3.45E-02 -3.54E-02 -3.53E-02 -3.75E-02 -3.56E-02 -3.52E-02 -3.53E-02 -3.58E-02 -3.57E-02 -3.70E-02 -3.62E-02 -3.57E-02 75 -3.46E-02 -3.56E-02 -3.54E-02 -3.75E-02 -3.57E-02 -3.53E-02 -3.54E-02 -3.59E-02 -3.58E-02 -3.71E-02 -3.63E-02 -3.58E-02 100 -3.43E-02 -3.53E-02 -3.52E-02 -3.71E-02 -3.54E-02 -3.51E-02 -3.52E-02 -3.58E-02 -3.57E-02 -3.69E-02 -3.62E-02 -3.57E-02 200 -3.36E-02 -3.46E-02 -3.42E-02 -3.62E-02 -3.45E-02 -3.45E-02 -3.45E-02 -3.54E-02 -3.51E-02 -3.64E-02 -3.63E-02 -3.57E-02 -3.64E-02 8.02E-04 -3.47E-02 -3.80E-02 -2.50E-02 PASS -3.59E-02 9.90E-04 -3.38E-02 -3.79E-02 -2.50E-02 PASS -3.57E-02 1.01E-03 -3.36E-02 -3.77E-02 -2.50E-02 PASS -3.56E-02 1.01E-03 -3.35E-02 -3.77E-02 -2.50E-02 PASS -3.57E-02 9.30E-04 -3.38E-02 -3.76E-02 -2.50E-02 PASS -3.59E-02 9.30E-04 -3.39E-02 -3.78E-02 -2.50E-02 PASS -3.59E-02 9.04E-04 -3.40E-02 -3.77E-02 -2.50E-02 PASS -3.57E-02 8.85E-04 -3.39E-02 -3.76E-02 -2.50E-02 PASS -3.58E-02 8.70E-04 -3.41E-02 -3.76E-02 -2.50E-02 PASS -3.56E-02 8.44E-04 -3.39E-02 -3.73E-02 -2.50E-02 PASS -3.49E-02 8.87E-04 -3.31E-02 -3.67E-02 -2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 292 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Maximum Output Sink Current @5V #4 (A) 0.00E+00 -5.00E-03 -1.00E-02 -1.50E-02 -2.00E-02 -2.50E-02 -3.00E-02 -3.50E-02 -4.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.144. Plot of Maximum Output Sink Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 293 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.144. Raw data for Maximum Output Sink Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Maximum Output Sink Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -3.59E-02 -3.62E-02 -3.65E-02 -3.67E-02 -3.71E-02 -3.59E-02 -3.57E-02 -3.58E-02 -3.59E-02 -3.59E-02 -3.64E-02 -3.57E-02 10 -3.56E-02 -3.54E-02 -3.61E-02 -3.68E-02 -3.68E-02 -3.52E-02 -3.50E-02 -3.51E-02 -3.54E-02 -3.52E-02 -3.64E-02 -3.57E-02 20 -3.52E-02 -3.52E-02 -3.58E-02 -3.67E-02 -3.65E-02 -3.49E-02 -3.46E-02 -3.48E-02 -3.51E-02 -3.49E-02 -3.64E-02 -3.57E-02 30 -3.51E-02 -3.52E-02 -3.57E-02 -3.67E-02 -3.64E-02 -3.48E-02 -3.45E-02 -3.47E-02 -3.50E-02 -3.48E-02 -3.64E-02 -3.57E-02 40 -3.51E-02 -3.53E-02 -3.58E-02 -3.67E-02 -3.64E-02 -3.48E-02 -3.46E-02 -3.47E-02 -3.50E-02 -3.50E-02 -3.64E-02 -3.57E-02 50 -3.53E-02 -3.54E-02 -3.61E-02 -3.67E-02 -3.66E-02 -3.49E-02 -3.47E-02 -3.50E-02 -3.52E-02 -3.51E-02 -3.65E-02 -3.58E-02 60 -3.53E-02 -3.54E-02 -3.62E-02 -3.65E-02 -3.65E-02 -3.49E-02 -3.47E-02 -3.49E-02 -3.52E-02 -3.50E-02 -3.65E-02 -3.58E-02 70 -3.52E-02 -3.53E-02 -3.59E-02 -3.63E-02 -3.64E-02 -3.48E-02 -3.46E-02 -3.48E-02 -3.51E-02 -3.49E-02 -3.64E-02 -3.57E-02 75 -3.53E-02 -3.55E-02 -3.61E-02 -3.64E-02 -3.65E-02 -3.50E-02 -3.47E-02 -3.48E-02 -3.52E-02 -3.50E-02 -3.65E-02 -3.58E-02 100 -3.51E-02 -3.52E-02 -3.59E-02 -3.61E-02 -3.63E-02 -3.47E-02 -3.45E-02 -3.46E-02 -3.50E-02 -3.46E-02 -3.64E-02 -3.57E-02 200 -3.45E-02 -3.46E-02 -3.54E-02 -3.51E-02 -3.54E-02 -3.40E-02 -3.36E-02 -3.35E-02 -3.42E-02 -3.37E-02 -3.64E-02 -3.57E-02 -3.62E-02 4.69E-04 -3.52E-02 -3.71E-02 -2.50E-02 PASS -3.57E-02 6.67E-04 -3.43E-02 -3.70E-02 -2.50E-02 PASS -3.54E-02 7.32E-04 -3.39E-02 -3.69E-02 -2.50E-02 PASS -3.53E-02 7.39E-04 -3.38E-02 -3.68E-02 -2.50E-02 PASS -3.53E-02 7.22E-04 -3.38E-02 -3.68E-02 -2.50E-02 PASS -3.55E-02 7.06E-04 -3.40E-02 -3.70E-02 -2.50E-02 PASS -3.55E-02 6.79E-04 -3.41E-02 -3.69E-02 -2.50E-02 PASS -3.53E-02 6.49E-04 -3.40E-02 -3.67E-02 -2.50E-02 PASS -3.55E-02 6.68E-04 -3.41E-02 -3.68E-02 -2.50E-02 PASS -3.52E-02 6.66E-04 -3.38E-02 -3.66E-02 -2.50E-02 PASS -3.44E-02 7.28E-04 -3.29E-02 -3.59E-02 -2.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 294 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @5V #1 (A) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.145. Plot of Positive Short-Circuit Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 295 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.145. Raw data for Positive Short-Circuit Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.28E-02 8.42E-02 8.48E-02 8.65E-02 8.68E-02 8.27E-02 8.26E-02 8.35E-02 8.40E-02 8.27E-02 8.41E-02 8.45E-02 10 8.28E-02 8.44E-02 8.49E-02 8.67E-02 8.69E-02 8.28E-02 8.27E-02 8.37E-02 8.42E-02 8.28E-02 8.43E-02 8.47E-02 20 8.28E-02 8.43E-02 8.49E-02 8.66E-02 8.69E-02 8.28E-02 8.27E-02 8.36E-02 8.41E-02 8.28E-02 8.43E-02 8.47E-02 30 8.27E-02 8.42E-02 8.48E-02 8.64E-02 8.68E-02 8.27E-02 8.25E-02 8.36E-02 8.41E-02 8.27E-02 8.43E-02 8.47E-02 40 8.26E-02 8.41E-02 8.47E-02 8.64E-02 8.67E-02 8.27E-02 8.25E-02 8.35E-02 8.40E-02 8.26E-02 8.43E-02 8.47E-02 50 8.26E-02 8.41E-02 8.47E-02 8.63E-02 8.67E-02 8.27E-02 8.24E-02 8.35E-02 8.40E-02 8.26E-02 8.43E-02 8.47E-02 60 8.26E-02 8.40E-02 8.46E-02 8.63E-02 8.66E-02 8.26E-02 8.24E-02 8.34E-02 8.39E-02 8.25E-02 8.42E-02 8.47E-02 70 8.25E-02 8.39E-02 8.46E-02 8.62E-02 8.65E-02 8.25E-02 8.23E-02 8.34E-02 8.39E-02 8.24E-02 8.42E-02 8.46E-02 75 8.25E-02 8.39E-02 8.45E-02 8.62E-02 8.66E-02 8.25E-02 8.23E-02 8.33E-02 8.39E-02 8.24E-02 8.43E-02 8.47E-02 100 8.24E-02 8.38E-02 8.44E-02 8.61E-02 8.64E-02 8.24E-02 8.22E-02 8.33E-02 8.38E-02 8.23E-02 8.42E-02 8.47E-02 200 8.22E-02 8.34E-02 8.41E-02 8.57E-02 8.61E-02 8.22E-02 8.18E-02 8.29E-02 8.34E-02 8.21E-02 8.42E-02 8.46E-02 8.41E-02 1.57E-03 8.73E-02 8.08E-02 5.50E-02 PASS 8.42E-02 1.58E-03 8.74E-02 8.09E-02 5.50E-02 PASS 8.41E-02 1.55E-03 8.73E-02 8.09E-02 5.50E-02 PASS 8.40E-02 1.56E-03 8.72E-02 8.08E-02 5.50E-02 PASS 8.40E-02 1.55E-03 8.72E-02 8.08E-02 5.50E-02 PASS 8.40E-02 1.55E-03 8.72E-02 8.08E-02 5.50E-02 PASS 8.39E-02 1.55E-03 8.71E-02 8.07E-02 5.50E-02 PASS 8.38E-02 1.55E-03 8.70E-02 8.06E-02 5.50E-02 PASS 8.38E-02 1.55E-03 8.70E-02 8.06E-02 5.50E-02 PASS 8.37E-02 1.53E-03 8.69E-02 8.05E-02 5.50E-02 PASS 8.34E-02 1.51E-03 8.65E-02 8.03E-02 5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 296 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @5V #2 (A) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.146. Plot of Positive Short-Circuit Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 297 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.146. Raw data for Positive Short-Circuit Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.24E-02 8.44E-02 8.37E-02 8.72E-02 8.39E-02 8.27E-02 8.42E-02 8.48E-02 8.45E-02 8.66E-02 8.33E-02 8.23E-02 10 8.24E-02 8.45E-02 8.39E-02 8.73E-02 8.40E-02 8.28E-02 8.43E-02 8.50E-02 8.47E-02 8.67E-02 8.35E-02 8.25E-02 20 8.24E-02 8.44E-02 8.38E-02 8.73E-02 8.39E-02 8.27E-02 8.42E-02 8.49E-02 8.46E-02 8.67E-02 8.35E-02 8.26E-02 30 8.23E-02 8.43E-02 8.37E-02 8.72E-02 8.38E-02 8.26E-02 8.41E-02 8.48E-02 8.46E-02 8.66E-02 8.35E-02 8.25E-02 40 8.23E-02 8.42E-02 8.37E-02 8.72E-02 8.37E-02 8.25E-02 8.41E-02 8.47E-02 8.45E-02 8.65E-02 8.35E-02 8.25E-02 50 8.22E-02 8.42E-02 8.37E-02 8.72E-02 8.37E-02 8.26E-02 8.40E-02 8.47E-02 8.45E-02 8.65E-02 8.35E-02 8.25E-02 60 8.21E-02 8.41E-02 8.36E-02 8.71E-02 8.36E-02 8.24E-02 8.40E-02 8.46E-02 8.44E-02 8.64E-02 8.35E-02 8.25E-02 70 8.20E-02 8.40E-02 8.35E-02 8.71E-02 8.35E-02 8.24E-02 8.39E-02 8.46E-02 8.44E-02 8.64E-02 8.34E-02 8.25E-02 75 8.21E-02 8.40E-02 8.35E-02 8.71E-02 8.35E-02 8.24E-02 8.39E-02 8.46E-02 8.44E-02 8.64E-02 8.35E-02 8.25E-02 100 8.19E-02 8.39E-02 8.34E-02 8.70E-02 8.34E-02 8.22E-02 8.38E-02 8.45E-02 8.42E-02 8.63E-02 8.35E-02 8.25E-02 200 8.16E-02 8.35E-02 8.32E-02 8.68E-02 8.30E-02 8.20E-02 8.35E-02 8.41E-02 8.40E-02 8.59E-02 8.34E-02 8.24E-02 8.44E-02 1.52E-03 8.76E-02 8.13E-02 5.50E-02 PASS 8.46E-02 1.52E-03 8.77E-02 8.14E-02 5.50E-02 PASS 8.45E-02 1.54E-03 8.77E-02 8.13E-02 5.50E-02 PASS 8.44E-02 1.54E-03 8.76E-02 8.12E-02 5.50E-02 PASS 8.43E-02 1.55E-03 8.75E-02 8.12E-02 5.50E-02 PASS 8.43E-02 1.55E-03 8.75E-02 8.11E-02 5.50E-02 PASS 8.42E-02 1.56E-03 8.75E-02 8.10E-02 5.50E-02 PASS 8.42E-02 1.56E-03 8.74E-02 8.10E-02 5.50E-02 PASS 8.42E-02 1.56E-03 8.74E-02 8.10E-02 5.50E-02 PASS 8.41E-02 1.59E-03 8.73E-02 8.08E-02 5.50E-02 PASS 8.38E-02 1.60E-03 8.71E-02 8.05E-02 5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 298 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @5V #3 (A) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.147. Plot of Positive Short-Circuit Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 299 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.147. Raw data for Positive Short-Circuit Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.23E-02 8.45E-02 8.39E-02 8.74E-02 8.35E-02 8.25E-02 8.46E-02 8.48E-02 8.45E-02 8.65E-02 8.34E-02 8.21E-02 10 8.23E-02 8.46E-02 8.40E-02 8.75E-02 8.36E-02 8.27E-02 8.47E-02 8.51E-02 8.46E-02 8.66E-02 8.36E-02 8.23E-02 20 8.23E-02 8.45E-02 8.40E-02 8.74E-02 8.36E-02 8.25E-02 8.47E-02 8.50E-02 8.46E-02 8.66E-02 8.36E-02 8.23E-02 30 8.22E-02 8.44E-02 8.39E-02 8.73E-02 8.35E-02 8.25E-02 8.46E-02 8.50E-02 8.45E-02 8.64E-02 8.36E-02 8.23E-02 40 8.22E-02 8.44E-02 8.39E-02 8.73E-02 8.34E-02 8.24E-02 8.45E-02 8.49E-02 8.44E-02 8.64E-02 8.36E-02 8.23E-02 50 8.21E-02 8.43E-02 8.38E-02 8.72E-02 8.34E-02 8.24E-02 8.45E-02 8.49E-02 8.44E-02 8.63E-02 8.36E-02 8.22E-02 60 8.21E-02 8.42E-02 8.38E-02 8.71E-02 8.33E-02 8.23E-02 8.44E-02 8.48E-02 8.44E-02 8.63E-02 8.36E-02 8.22E-02 70 8.20E-02 8.41E-02 8.37E-02 8.70E-02 8.33E-02 8.22E-02 8.44E-02 8.47E-02 8.43E-02 8.62E-02 8.35E-02 8.22E-02 75 8.20E-02 8.41E-02 8.37E-02 8.70E-02 8.33E-02 8.22E-02 8.44E-02 8.47E-02 8.44E-02 8.62E-02 8.35E-02 8.22E-02 100 8.19E-02 8.40E-02 8.35E-02 8.69E-02 8.32E-02 8.21E-02 8.42E-02 8.46E-02 8.42E-02 8.61E-02 8.35E-02 8.22E-02 200 8.16E-02 8.36E-02 8.32E-02 8.66E-02 8.29E-02 8.17E-02 8.39E-02 8.44E-02 8.39E-02 8.57E-02 8.35E-02 8.22E-02 8.45E-02 1.58E-03 8.77E-02 8.12E-02 5.50E-02 PASS 8.46E-02 1.60E-03 8.79E-02 8.13E-02 5.50E-02 PASS 8.45E-02 1.59E-03 8.78E-02 8.12E-02 5.50E-02 PASS 8.44E-02 1.57E-03 8.77E-02 8.12E-02 5.50E-02 PASS 8.44E-02 1.58E-03 8.76E-02 8.11E-02 5.50E-02 PASS 8.43E-02 1.57E-03 8.76E-02 8.11E-02 5.50E-02 PASS 8.43E-02 1.59E-03 8.75E-02 8.10E-02 5.50E-02 PASS 8.42E-02 1.58E-03 8.74E-02 8.09E-02 5.50E-02 PASS 8.42E-02 1.59E-03 8.75E-02 8.09E-02 5.50E-02 PASS 8.41E-02 1.58E-03 8.73E-02 8.08E-02 5.50E-02 PASS 8.37E-02 1.57E-03 8.70E-02 8.05E-02 5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 300 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (-KTL) Biased Specification MIN Positive Short-Circuit Current @5V #4 (A) 9.00E-02 8.00E-02 7.00E-02 6.00E-02 5.00E-02 4.00E-02 3.00E-02 2.00E-02 1.00E-02 0.00E+00 0 50 100 150 Total Dose (krad(Si)) Figure 5.148. Plot of Positive Short-Circuit Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 301 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.148. Raw data for Positive Short-Circuit Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Positive Short-Circuit Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status 0 8.29E-02 8.41E-02 8.47E-02 8.63E-02 8.65E-02 8.28E-02 8.28E-02 8.34E-02 8.39E-02 8.26E-02 8.41E-02 8.46E-02 10 8.29E-02 8.43E-02 8.49E-02 8.64E-02 8.67E-02 8.29E-02 8.29E-02 8.36E-02 8.40E-02 8.27E-02 8.43E-02 8.48E-02 20 8.29E-02 8.42E-02 8.49E-02 8.63E-02 8.66E-02 8.29E-02 8.29E-02 8.36E-02 8.40E-02 8.27E-02 8.43E-02 8.48E-02 30 8.28E-02 8.41E-02 8.48E-02 8.62E-02 8.65E-02 8.28E-02 8.28E-02 8.35E-02 8.39E-02 8.25E-02 8.43E-02 8.47E-02 40 8.27E-02 8.41E-02 8.47E-02 8.62E-02 8.64E-02 8.27E-02 8.27E-02 8.35E-02 8.38E-02 8.24E-02 8.42E-02 8.47E-02 50 8.27E-02 8.40E-02 8.47E-02 8.61E-02 8.64E-02 8.27E-02 8.27E-02 8.34E-02 8.38E-02 8.24E-02 8.43E-02 8.47E-02 60 8.26E-02 8.39E-02 8.47E-02 8.61E-02 8.63E-02 8.26E-02 8.27E-02 8.34E-02 8.36E-02 8.23E-02 8.42E-02 8.47E-02 70 8.25E-02 8.39E-02 8.46E-02 8.59E-02 8.63E-02 8.25E-02 8.26E-02 8.33E-02 8.36E-02 8.22E-02 8.42E-02 8.47E-02 75 8.25E-02 8.39E-02 8.46E-02 8.60E-02 8.63E-02 8.25E-02 8.26E-02 8.33E-02 8.37E-02 8.22E-02 8.43E-02 8.47E-02 100 8.24E-02 8.38E-02 8.45E-02 8.58E-02 8.62E-02 8.23E-02 8.24E-02 8.32E-02 8.35E-02 8.21E-02 8.42E-02 8.47E-02 200 8.21E-02 8.35E-02 8.43E-02 8.55E-02 8.58E-02 8.20E-02 8.22E-02 8.29E-02 8.31E-02 8.17E-02 8.42E-02 8.47E-02 8.40E-02 1.45E-03 8.70E-02 8.10E-02 5.50E-02 PASS 8.41E-02 1.46E-03 8.71E-02 8.11E-02 5.50E-02 PASS 8.41E-02 1.43E-03 8.71E-02 8.12E-02 5.50E-02 PASS 8.40E-02 1.44E-03 8.70E-02 8.10E-02 5.50E-02 PASS 8.39E-02 1.45E-03 8.69E-02 8.09E-02 5.50E-02 PASS 8.39E-02 1.45E-03 8.69E-02 8.09E-02 5.50E-02 PASS 8.38E-02 1.46E-03 8.68E-02 8.08E-02 5.50E-02 PASS 8.37E-02 1.45E-03 8.67E-02 8.07E-02 5.50E-02 PASS 8.38E-02 1.46E-03 8.68E-02 8.07E-02 5.50E-02 PASS 8.36E-02 1.47E-03 8.66E-02 8.06E-02 5.50E-02 PASS 8.33E-02 1.47E-03 8.63E-02 8.03E-02 5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 302 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @5V #1 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.149. Plot of Negative Short-Circuit Current @5V #1 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 303 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.149. Raw data for Negative Short-Circuit Current @5V #1 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @5V #1 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -7.50E-02 -7.59E-02 -7.69E-02 -7.84E-02 -7.88E-02 -7.48E-02 -7.47E-02 -7.53E-02 -7.61E-02 -7.48E-02 -7.63E-02 -7.63E-02 10 -7.50E-02 -7.60E-02 -7.69E-02 -7.85E-02 -7.89E-02 -7.49E-02 -7.49E-02 -7.55E-02 -7.62E-02 -7.50E-02 -7.65E-02 -7.64E-02 20 -7.50E-02 -7.59E-02 -7.69E-02 -7.84E-02 -7.87E-02 -7.49E-02 -7.47E-02 -7.54E-02 -7.61E-02 -7.50E-02 -7.65E-02 -7.64E-02 30 -7.49E-02 -7.58E-02 -7.68E-02 -7.83E-02 -7.87E-02 -7.47E-02 -7.46E-02 -7.53E-02 -7.61E-02 -7.49E-02 -7.65E-02 -7.64E-02 40 -7.48E-02 -7.58E-02 -7.68E-02 -7.81E-02 -7.86E-02 -7.47E-02 -7.46E-02 -7.52E-02 -7.60E-02 -7.48E-02 -7.65E-02 -7.64E-02 50 -7.49E-02 -7.57E-02 -7.68E-02 -7.81E-02 -7.86E-02 -7.48E-02 -7.45E-02 -7.52E-02 -7.60E-02 -7.47E-02 -7.66E-02 -7.64E-02 60 -7.48E-02 -7.57E-02 -7.67E-02 -7.80E-02 -7.86E-02 -7.47E-02 -7.45E-02 -7.51E-02 -7.59E-02 -7.47E-02 -7.65E-02 -7.64E-02 70 -7.47E-02 -7.57E-02 -7.67E-02 -7.79E-02 -7.85E-02 -7.46E-02 -7.44E-02 -7.50E-02 -7.58E-02 -7.46E-02 -7.65E-02 -7.64E-02 75 -7.48E-02 -7.56E-02 -7.67E-02 -7.79E-02 -7.84E-02 -7.46E-02 -7.44E-02 -7.50E-02 -7.58E-02 -7.46E-02 -7.66E-02 -7.64E-02 100 -7.46E-02 -7.55E-02 -7.65E-02 -7.78E-02 -7.83E-02 -7.45E-02 -7.43E-02 -7.48E-02 -7.57E-02 -7.45E-02 -7.66E-02 -7.64E-02 200 -7.44E-02 -7.52E-02 -7.62E-02 -7.73E-02 -7.79E-02 -7.41E-02 -7.39E-02 -7.44E-02 -7.53E-02 -7.41E-02 -7.65E-02 -7.64E-02 -7.61E-02 1.48E-03 -7.30E-02 -7.91E-02 -5.50E-02 PASS -7.62E-02 1.48E-03 -7.31E-02 -7.92E-02 -5.50E-02 PASS -7.61E-02 1.46E-03 -7.31E-02 -7.91E-02 -5.50E-02 PASS -7.60E-02 1.47E-03 -7.30E-02 -7.90E-02 -5.50E-02 PASS -7.60E-02 1.45E-03 -7.30E-02 -7.90E-02 -5.50E-02 PASS -7.59E-02 1.47E-03 -7.29E-02 -7.90E-02 -5.50E-02 PASS -7.59E-02 1.44E-03 -7.29E-02 -7.88E-02 -5.50E-02 PASS -7.58E-02 1.45E-03 -7.28E-02 -7.88E-02 -5.50E-02 PASS -7.58E-02 1.44E-03 -7.28E-02 -7.88E-02 -5.50E-02 PASS -7.57E-02 1.43E-03 -7.27E-02 -7.86E-02 -5.50E-02 PASS -7.53E-02 1.41E-03 -7.24E-02 -7.82E-02 -5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 304 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @5V #2 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 -9.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.150. Plot of Negative Short-Circuit Current @5V #2 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 305 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.150. Raw data for Negative Short-Circuit Current @5V #2 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @5V #2 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -7.44E-02 -7.63E-02 -7.58E-02 -7.91E-02 -7.59E-02 -7.47E-02 -7.61E-02 -7.67E-02 -7.65E-02 -7.88E-02 -7.55E-02 -7.44E-02 10 -7.44E-02 -7.64E-02 -7.60E-02 -7.92E-02 -7.61E-02 -7.48E-02 -7.62E-02 -7.68E-02 -7.66E-02 -7.89E-02 -7.56E-02 -7.46E-02 20 -7.44E-02 -7.63E-02 -7.59E-02 -7.92E-02 -7.61E-02 -7.47E-02 -7.62E-02 -7.67E-02 -7.66E-02 -7.89E-02 -7.56E-02 -7.46E-02 30 -7.42E-02 -7.62E-02 -7.58E-02 -7.91E-02 -7.59E-02 -7.46E-02 -7.61E-02 -7.67E-02 -7.65E-02 -7.87E-02 -7.56E-02 -7.46E-02 40 -7.43E-02 -7.62E-02 -7.57E-02 -7.90E-02 -7.59E-02 -7.46E-02 -7.60E-02 -7.66E-02 -7.64E-02 -7.87E-02 -7.56E-02 -7.46E-02 50 -7.41E-02 -7.61E-02 -7.57E-02 -7.90E-02 -7.58E-02 -7.45E-02 -7.60E-02 -7.66E-02 -7.64E-02 -7.86E-02 -7.56E-02 -7.45E-02 60 -7.41E-02 -7.61E-02 -7.57E-02 -7.89E-02 -7.58E-02 -7.44E-02 -7.59E-02 -7.65E-02 -7.63E-02 -7.86E-02 -7.56E-02 -7.45E-02 70 -7.40E-02 -7.59E-02 -7.56E-02 -7.88E-02 -7.57E-02 -7.44E-02 -7.59E-02 -7.65E-02 -7.63E-02 -7.86E-02 -7.56E-02 -7.45E-02 75 -7.40E-02 -7.60E-02 -7.56E-02 -7.88E-02 -7.57E-02 -7.43E-02 -7.58E-02 -7.64E-02 -7.62E-02 -7.86E-02 -7.56E-02 -7.45E-02 100 -7.39E-02 -7.58E-02 -7.55E-02 -7.86E-02 -7.56E-02 -7.42E-02 -7.58E-02 -7.64E-02 -7.62E-02 -7.85E-02 -7.56E-02 -7.45E-02 200 -7.35E-02 -7.55E-02 -7.52E-02 -7.82E-02 -7.52E-02 -7.38E-02 -7.55E-02 -7.61E-02 -7.57E-02 -7.81E-02 -7.56E-02 -7.45E-02 -7.64E-02 1.51E-03 -7.33E-02 -7.95E-02 -5.50E-02 PASS -7.65E-02 1.52E-03 -7.34E-02 -7.97E-02 -5.50E-02 PASS -7.65E-02 1.54E-03 -7.33E-02 -7.97E-02 -5.50E-02 PASS -7.64E-02 1.54E-03 -7.32E-02 -7.96E-02 -5.50E-02 PASS -7.63E-02 1.53E-03 -7.32E-02 -7.95E-02 -5.50E-02 PASS -7.63E-02 1.54E-03 -7.31E-02 -7.95E-02 -5.50E-02 PASS -7.62E-02 1.53E-03 -7.31E-02 -7.94E-02 -5.50E-02 PASS -7.62E-02 1.56E-03 -7.29E-02 -7.94E-02 -5.50E-02 PASS -7.61E-02 1.53E-03 -7.30E-02 -7.93E-02 -5.50E-02 PASS -7.61E-02 1.54E-03 -7.29E-02 -7.92E-02 -5.50E-02 PASS -7.57E-02 1.55E-03 -7.25E-02 -7.89E-02 -5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 306 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @5V #3 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 -9.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.151. Plot of Negative Short-Circuit Current @5V #3 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 307 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.151. Raw data for Negative Short-Circuit Current @5V #3 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @5V #3 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -7.44E-02 -7.63E-02 -7.60E-02 -7.96E-02 -7.58E-02 -7.47E-02 -7.65E-02 -7.68E-02 -7.65E-02 -7.90E-02 -7.58E-02 -7.44E-02 10 -7.44E-02 -7.64E-02 -7.61E-02 -7.97E-02 -7.59E-02 -7.49E-02 -7.67E-02 -7.69E-02 -7.67E-02 -7.91E-02 -7.60E-02 -7.46E-02 20 -7.44E-02 -7.64E-02 -7.61E-02 -7.97E-02 -7.58E-02 -7.49E-02 -7.66E-02 -7.69E-02 -7.66E-02 -7.90E-02 -7.61E-02 -7.46E-02 30 -7.42E-02 -7.63E-02 -7.59E-02 -7.95E-02 -7.57E-02 -7.47E-02 -7.66E-02 -7.68E-02 -7.65E-02 -7.89E-02 -7.60E-02 -7.45E-02 40 -7.41E-02 -7.63E-02 -7.60E-02 -7.95E-02 -7.57E-02 -7.46E-02 -7.64E-02 -7.68E-02 -7.64E-02 -7.89E-02 -7.60E-02 -7.46E-02 50 -7.41E-02 -7.62E-02 -7.58E-02 -7.94E-02 -7.56E-02 -7.46E-02 -7.65E-02 -7.67E-02 -7.64E-02 -7.89E-02 -7.60E-02 -7.45E-02 60 -7.40E-02 -7.62E-02 -7.58E-02 -7.93E-02 -7.56E-02 -7.46E-02 -7.64E-02 -7.67E-02 -7.64E-02 -7.87E-02 -7.59E-02 -7.45E-02 70 -7.39E-02 -7.61E-02 -7.57E-02 -7.92E-02 -7.55E-02 -7.45E-02 -7.63E-02 -7.67E-02 -7.63E-02 -7.87E-02 -7.59E-02 -7.45E-02 75 -7.39E-02 -7.61E-02 -7.57E-02 -7.92E-02 -7.55E-02 -7.45E-02 -7.63E-02 -7.67E-02 -7.63E-02 -7.88E-02 -7.60E-02 -7.45E-02 100 -7.38E-02 -7.59E-02 -7.56E-02 -7.91E-02 -7.53E-02 -7.44E-02 -7.63E-02 -7.65E-02 -7.62E-02 -7.86E-02 -7.60E-02 -7.45E-02 200 -7.34E-02 -7.56E-02 -7.52E-02 -7.86E-02 -7.49E-02 -7.40E-02 -7.59E-02 -7.62E-02 -7.59E-02 -7.83E-02 -7.59E-02 -7.45E-02 -7.66E-02 1.64E-03 -7.32E-02 -7.99E-02 -5.50E-02 PASS -7.67E-02 1.65E-03 -7.33E-02 -8.01E-02 -5.50E-02 PASS -7.66E-02 1.64E-03 -7.32E-02 -8.00E-02 -5.50E-02 PASS -7.65E-02 1.63E-03 -7.32E-02 -7.99E-02 -5.50E-02 PASS -7.65E-02 1.65E-03 -7.31E-02 -7.99E-02 -5.50E-02 PASS -7.64E-02 1.64E-03 -7.30E-02 -7.98E-02 -5.50E-02 PASS -7.64E-02 1.64E-03 -7.30E-02 -7.98E-02 -5.50E-02 PASS -7.63E-02 1.65E-03 -7.29E-02 -7.97E-02 -5.50E-02 PASS -7.63E-02 1.66E-03 -7.29E-02 -7.97E-02 -5.50E-02 PASS -7.62E-02 1.66E-03 -7.27E-02 -7.96E-02 -5.50E-02 PASS -7.58E-02 1.65E-03 -7.24E-02 -7.92E-02 -5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 308 RLAT Report 10-326 100808 R1.0 Average Biased Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Ps90%/90% (+KTL) Biased Specification MAX Negative Short-Circuit Current @5V #4 (A) 0.00E+00 -1.00E-02 -2.00E-02 -3.00E-02 -4.00E-02 -5.00E-02 -6.00E-02 -7.00E-02 -8.00E-02 0 50 100 150 Total Dose (krad(Si)) Figure 5.152. Plot of Negative Short-Circuit Current @5V #4 (A) versus total dose. The solid diamonds are the average of the measured data points for the samples irradiated under electrical bias and the black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples irradiated under electrical bias. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test plan. An ISO 9001:2008 and DSCC Certified Company 309 200 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table 5.152. Raw data for Negative Short-Circuit Current @5V #4 (A) versus total dose, including the statistical analysis, specification and the status of the testing (pass/fail). Total Dose (krad(Si)) Negative Short-Circuit Current @5V #4 (A) Device 1245 1246 1247 1248 1249 1250 1251 1261 1262 1263 1264 1265 Biased Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MAX Status 0 -7.50E-02 -7.60E-02 -7.70E-02 -7.83E-02 -7.85E-02 -7.47E-02 -7.47E-02 -7.53E-02 -7.59E-02 -7.47E-02 -7.62E-02 -7.67E-02 10 -7.50E-02 -7.62E-02 -7.72E-02 -7.84E-02 -7.85E-02 -7.48E-02 -7.48E-02 -7.56E-02 -7.61E-02 -7.48E-02 -7.64E-02 -7.69E-02 20 -7.50E-02 -7.61E-02 -7.71E-02 -7.84E-02 -7.85E-02 -7.47E-02 -7.47E-02 -7.55E-02 -7.60E-02 -7.47E-02 -7.64E-02 -7.69E-02 30 -7.49E-02 -7.60E-02 -7.70E-02 -7.82E-02 -7.84E-02 -7.46E-02 -7.46E-02 -7.53E-02 -7.59E-02 -7.47E-02 -7.64E-02 -7.69E-02 40 -7.48E-02 -7.59E-02 -7.69E-02 -7.81E-02 -7.83E-02 -7.46E-02 -7.45E-02 -7.53E-02 -7.58E-02 -7.46E-02 -7.63E-02 -7.69E-02 50 -7.48E-02 -7.60E-02 -7.69E-02 -7.81E-02 -7.83E-02 -7.46E-02 -7.45E-02 -7.53E-02 -7.58E-02 -7.46E-02 -7.63E-02 -7.68E-02 60 -7.47E-02 -7.58E-02 -7.69E-02 -7.80E-02 -7.81E-02 -7.45E-02 -7.45E-02 -7.52E-02 -7.57E-02 -7.45E-02 -7.63E-02 -7.68E-02 70 -7.46E-02 -7.58E-02 -7.68E-02 -7.79E-02 -7.81E-02 -7.44E-02 -7.44E-02 -7.52E-02 -7.57E-02 -7.44E-02 -7.63E-02 -7.68E-02 75 -7.46E-02 -7.58E-02 -7.68E-02 -7.79E-02 -7.80E-02 -7.44E-02 -7.44E-02 -7.51E-02 -7.57E-02 -7.44E-02 -7.63E-02 -7.68E-02 100 -7.45E-02 -7.57E-02 -7.67E-02 -7.77E-02 -7.79E-02 -7.43E-02 -7.43E-02 -7.50E-02 -7.56E-02 -7.43E-02 -7.63E-02 -7.68E-02 200 -7.41E-02 -7.53E-02 -7.64E-02 -7.73E-02 -7.75E-02 -7.40E-02 -7.39E-02 -7.46E-02 -7.52E-02 -7.39E-02 -7.63E-02 -7.68E-02 -7.60E-02 1.45E-03 -7.30E-02 -7.90E-02 -5.50E-02 PASS -7.61E-02 1.45E-03 -7.31E-02 -7.91E-02 -5.50E-02 PASS -7.61E-02 1.46E-03 -7.31E-02 -7.91E-02 -5.50E-02 PASS -7.60E-02 1.45E-03 -7.30E-02 -7.89E-02 -5.50E-02 PASS -7.59E-02 1.43E-03 -7.29E-02 -7.88E-02 -5.50E-02 PASS -7.59E-02 1.44E-03 -7.29E-02 -7.88E-02 -5.50E-02 PASS -7.58E-02 1.43E-03 -7.29E-02 -7.87E-02 -5.50E-02 PASS -7.57E-02 1.43E-03 -7.28E-02 -7.87E-02 -5.50E-02 PASS -7.57E-02 1.42E-03 -7.28E-02 -7.87E-02 -5.50E-02 PASS -7.56E-02 1.41E-03 -7.27E-02 -7.85E-02 -5.50E-02 PASS -7.52E-02 1.40E-03 -7.23E-02 -7.81E-02 -5.50E-02 PASS An ISO 9001:2008 and DSCC Certified Company 310 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 6.0. Summary / Conclusions The total ionizing dose testing described in this final report was performed using the facilities at Radiation Assured Devices’ Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose (TID) source is a JLSA 84-21 irradiator modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 120rad(Si)/s, determined by the distance from the source. The parametric data was obtained as read and record and all the raw data plus an attributes summary are contained in a separate Excel file. The attributes data contains the average, standard deviation and the average with the KTL values applied. The KTL value used in this work is 2.065 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 10-piece sample size. The 90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535 sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the following criteria must be met for a device to pass the RLAT: following the radiation exposure each of the 10 pieces irradiated under electrical bias shall pass the specification value. If any of the 10 pieces irradiated under electrical bias exceed the datasheet specifications, then the lot could be logged as a failure. Based on this criterion the RH1814MW QUAD OP AMP (from the lot date code identified on the first page of this test report) PASSED the RLAT to the maximum tested dose level of 200krad(Si) with all parameters remaining within their datasheet specifications. The data shown in this report uses much finer dose increments at the low dose levels to better understand the low total dose performance. In previous tests (with larger dose increments) we have observed degradation of selected VOS, CMRR and PSRR parameters with the units improving with total dose, passing at the 100krad(Si) and 200krad(Si) dose levels. It appears that using relatively large dose increments can cause a low total dose “failure” possible due to a slightly different radiation response of matching of OpAmp input transistors. The LT1814 datasheet p.12 "Circuit Operation" discussion describes complementary NPN and PNP emitter followers buffering input transistors. Uneven gamma-induced degradation of the various input transistors could produce large voltage offsets, possibly recovering after significant charge saturation in the oxides. Figures 5.1 through 5.152 show plots of all the measured parameters versus total ionizing dose while Tables 5.1 – 5.152 show the corresponding raw data for each of these parameters. An ISO 9001:2008 and DSCC Certified Company 311 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix A: Photograph of device-under-test to show part markings An ISO 9001:2008 and DSCC Certified Company 312 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix B: TID Bias Connections (Extracted from LINEAR TECHNOLOGY CORPORATION RH1814M Datasheet) Biased Samples: Pin Function Connection / Bias 1 OUT A To Pin 2 via 10kΩ 2 -IN A To Pin 1 via 10kΩ 3 +IN A To 2.5V via 10kΩ Resistor 4 V+ To +5V using 0.1μF Decoupling to GND 5 +IN B To 2.5V via 10kΩ Resistor 6 -IN B To Pin 7 via 10kΩ 7 OUT B To Pin 6 via 10kΩ 8 OUT C To Pin 9 via 10kΩ 9 -IN C To Pin 8 via 10kΩ 10 +IN C To 2.5V via 10kΩ Resistor 11 V- To -5V using 0.1μF Decoupling to GND 12 +IN D To 2.5V via 10kΩ Resistor 13 -IN D To Pin 14 via 10kΩ 14 OUT D To Pin 13 via 10kΩ An ISO 9001:2008 and DSCC Certified Company 313 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Figure B.1. Irradiation bias drawing for the units to be irradiated under electrical bias. This figure was extracted from LINEAR TECHNOLOGY CORPORATION RH1814M Datasheet. Figure B.2. W package drawing (for reference only). This figure was extracted from LINEAR TECHNOLOGY CORPORATION RH1814M Datasheet. An ISO 9001:2008 and DSCC Certified Company 314 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Appendix C: Electrical Test Parameters and Conditions All electrical tests for this device are performed on one of Radiation Assured Device’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test System achieves accuracy and sensitivity through the use of software self-calibration and an internal relay matrix with separate family boards and custom personality adapter boards. The tester uses this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and establish the needed measurement loops for all the tests performed. The tests will be conducted using the LTS-2101 Linear Family Board, LTS0600 Socket Assembly and the RH1814W BGSS-080826 DUT board. The measured parameters and test conditions are shown in Tables C.1 and C.2. A listing of the measurement precision/resolution for each parameter is shown in Tables C.3 and C.4. The precision/resolution values were obtained either from test data or from the DAC resolution of the LTS-2020. To generate the precision/resolution shown in Table C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90 KTL statistics were applied to the measured standard deviation to generate the final measurement range. This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020 mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the measurement resolution is limited by the internal DACs, which results in a measured standard deviation of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC. Note that the testing and statistics used in this document are based on an “analysis of variables” technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p. 91 for a discussion of statistical treatments). Not all measured parameters are well suited to this approach due to inherent large variations. One such parameter is pre-irradiation Large Signal Voltage Gain, where the device exhibits extreme sensitivity to input conditions, resulting in a very large standard deviation. If necessary, larger samples sizes could be used to qualify these parameters using an “attributes” approach. An ISO 9001:2008 and DSCC Certified Company 315 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.1. Measured parameters and test conditions for VS=±5V. TEST DESCRIPTION Positive Supply Current Negative Supply Current Input Offset Voltage (Op Amp 1-4) Input Offset Current (Op Amp 1-4) + Input Bias Current (Op Amp 1-4) - Input Bias Current (Op Amp 1-4) CMRR (Op Amp 1-4) PSRR (Op Amp 1-4) Large Signal Voltage Gain RL=500 (Op Amp 1-4) Large Signal Voltage Gain RL=100 (Op Amp 1-4) Channel Separation (Op Amp 1-4, all permutations) Output Voltage Swing High RL=500 (Op Amp 1-4) Output Voltage Swing High RL=100 (Op Amp 1-4) Output Voltage Swing Low RL=500 (Op Amp 1-4) Output Voltage Swing Low RL=100 (Op Amp 1-4) Maximum Output Source Current (Op Amp 1-4) Maximum Output Sink Current (Op Amp 1-4) Positive Short-Circuit Current (Op Amp 1-4) Negative Short-Circuit Current (Op Amp 1-4) TEST CONDITIONS VS=±5V VS=±5V VS=±5V VS=±5V VS=±5V VS=±5V VS=±5V, VCM=±3.5V VS=±2V to ±5.5V RL=500Ω, VO=±3V RL=100Ω, VO=±3V RL=100Ω, VO=±3V RL=500Ω, VOD=30mV, VS=±5V RL=100Ω, VOD=30mV, VS=±5V RL=500Ω, VOD=30mV, VS=±5V RL=100Ω, VOD=30mV, VS=±5V VO=3V, VOD=30mV, VS=±5V VO=-3V, VOD=30mV, VS=±5V VOD=1V, VS=±5V VOD=1V, VS=±5V An ISO 9001:2008 and DSCC Certified Company 316 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 Table C.2. Measured parameters and test conditions for VS=5V. TEST DESCRIPTION Positive Supply Current Negative Supply Current Input Offset Voltage (Op Amp 1-4) Input Offset Current (Op Amp 1-4) + Input Bias Current (Op Amp 1-4) - Input Bias Current (Op Amp 1-4) CMRR (Op Amp 1-4) Large Signal Voltage Gain RL=500 (Op Amp 1-4) Large Signal Voltage Gain RL=100 (Op Amp 1-4) Channel Separation (Op Amp 1-4, all permutations) Output Voltage Swing High RL=500 (Op Amp 1-4) Output Voltage Swing High RL=100 (Op Amp 1-4) Output Voltage Swing Low RL=500 (Op Amp 1-4) Output Voltage Swing Low RL=100 (Op Amp 1-4) Maximum Output Source Current (Op Amp 1-4) Maximum Output Sink Current (Op Amp 1-4) Positive Short-Circuit Current (Op Amp 1-4) Negative Short-Circuit Current (Op Amp 1-4) TEST CONDITIONS VS=5V VS=5V VS=5V VS=5V VS=5V VS=5V VS=5V, VCM=1.5V to 3.5V RL=500Ω, VO=1.5 to 3.5V RL=100Ω, VO=1.5 to 3.5V RL=100Ω, VO=1.5 to 3.5V RL=500Ω, VOD=30mV, VS=5V RL=100Ω, VOD=30mV, VS=5V RL=500Ω, VOD=30mV, VS=5V RL=100Ω, VOD=30mV, VS=5V VO=3.5V, VOD=30mV, VS=5V VO=1.5V, VOD=30mV, VS=5V VOD=1V, VS=5V VOD=1V, VS=5V An ISO 9001:2008 and DSCC Certified Company 317 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.3. Measured parameters, pre-irradiation specifications, and measurement resolutions for VS=±5V. Pre-Irradiation Measurement Specification Resolution/Precision Positive Supply Current 14.4mA ± 2.50E-04A Negative Supply Current -14.4mA ± 2.46E-04A Input Offset Voltage (Op Amp 1-4) ±1.5mV ± 9.56E-06V Input Offset Current (Op Amp 1-4) ±400nA ± 1.07E-08A + Input Bias Current (Op Amp 1-4) ± 9.97E-09A ±4µA - Input Bias Current (Op Amp 1-4) ± 1.07E-08A ±4µA CMRR (Op Amp 1-4) 75dB ± 1.27E-01dB PSRR (Op Amp 1-4) 78dB ± 2.77E-01dB Large Signal Voltage Gain RL=500 (Op Amp 1-4) 1.5V/mV ± 6.53E-02V/mV Large Signal Voltage Gain RL=100 (Op Amp 1-4) 1V/mV ± 9.97E-02V/mV Channel Separation (Op Amp 1-4, all permutations) 82dB ± 3.19E+01dB Output Voltage Swing High RL=500 (Op Amp 1-4) 3.8V ± 4.29E-03V Output Voltage Swing High RL=100 (Op Amp 1-4) 3.35V ± 2.76E-03V Output Voltage Swing Low RL=500 (Op Amp 1-4) -3.8V ± 3.34E-03V Output Voltage Swing Low RL=100 (Op Amp 1-4) -3.35V ± 3.34E-03V Maximum Output Source Current (Op Amp 1-4) 40mA ± 2.49E-04A Maximum Output Sink Current (Op Amp 1-4) -40mA ± 1.46E-04A Positive Short-Circuit Current (Op Amp 1-4) 75mA ± 4.04E-04V Negative Short-Circuit Current (Op Amp 1-4) -75mA ± 4.14E-04A Measured Parameter An ISO 9001:2008 and DSCC Certified Company 318 RLAT Report 10-326 100808 R1.0 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 Table C.4. Measured parameters, pre-irradiation specifications, and measurement resolutions for VS=5V. Pre-Irradiation Measurement Specification Resolution/Precision Positive Supply Current 16mA ± 1.52E-04A Negative Supply Current -16mA ± 1.66E-04A Input Offset Voltage (Op Amp 1-4) ±2mV ± 8.44E-06V Input Offset Current (Op Amp 1-4) ±400nA ± 1.07E-08A + Input Bias Current (Op Amp 1-4) ± 8.79E-09A ±4µA - Input Bias Current (Op Amp 1-4) ± 9.97E-09A ±4µA CMRR (Op Amp 1-4) 73dB ± 2.84E-01dB Large Signal Voltage Gain RL=500 (Op Amp 1-4) 1.0V/mV ± 2.00E-02V/mV Large Signal Voltage Gain RL=100 (Op Amp 1-4) 0.7V/mV ± 8.71E-02V/mV Channel Separation (Op Amp 1-4, all permutations) 81dB ± 2.74E+01dB Output Voltage Swing High RL=500 (Op Amp 1-4) 3.9V ± 3.38E-03V Output Voltage Swing High RL=100 (Op Amp 1-4) 3.7V ± 2.47E-03V Output Voltage Swing Low RL=500 (Op Amp 1-4) 1.1V ± 2.19E-03V Output Voltage Swing Low RL=100 (Op Amp 1-4) 1.3V ± 2.01E-03V Maximum Output Source Current (Op Amp 1-4) 25mA ± 1.21E-04A Maximum Output Sink Current (Op Amp 1-4) -25mA ± 1.27E-04A Positive Short-Circuit Current (Op Amp 1-4) 55mA ± 2.21E-04A Negative Short-Circuit Current (Op Amp 1-4) -55mA ± 1.64E-04A Measured Parameter An ISO 9001:2008 and DSCC Certified Company 319 RLAT Report 10-326 100808 R1.0 Appendix D: List of Figures Used in Section 5 (RLAT Test Results) 5.1 5.2 5.3 5.4 5.5 5.6 5.7 5.8 5.9 5.10 5.11 5.12 5.13 5.14 5.15 5.16 5.17 5.18 5.19 5.20 5.21 5.22 5.23 5.24 5.25 5.26 5.27 5.28 5.29 5.30 5.31 5.32 5.33 5.34 5.35 5.36 5.37 5.38 5.39 Positive Supply Current @+/-5V (A) Negative Supply Current @+/-5V (A) Input Offset Voltage @+/-5V #1 (V) Input Offset Voltage @+/-5V #2 (V) Input Offset Voltage @+/-5V #3 (V) Input Offset Voltage @+/-5V #4 (V) Input Offset Current @+/-5V #1 (A) Input Offset Current @+/-5V #2 (A) Input Offset Current @+/-5V #3 (A) Input Offset Current @+/-5V #4 (A) Positive Input Bias Current @+/-5V #1 (A) Positive Input Bias Current @+/-5V #2 (A) Positive Input Bias Current @+/-5V #3 (A) Positive Input Bias Current @+/-5V #4 (A) Negative Input Bias Current @+/-5V #1 (A) Negative Input Bias Current @+/-5V #2 (A) Negative Input Bias Current @+/-5V #3 (A) Negative Input Bias Current @+/-5V #4 (A) Common Mode Rejection Ratio @+/-5V #1 (dB) Common Mode Rejection Ratio @+/-5V #2 (dB) Common Mode Rejection Ratio @+/-5V #3 (dB) Common Mode Rejection Ratio @+/-5V #4 (dB) Power Supply Rejection Ratio #1 (dB) Power Supply Rejection Ratio #2 (dB) Power Supply Rejection Ratio #3 (dB) Power Supply Rejection Ratio #4 (dB) Large Signal Voltage Gain @+/-5V RL=500 #1 (V/mV) Large Signal Voltage Gain @+/-5V RL=500 #2 (V/mV) Large Signal Voltage Gain @+/-5V RL=500 #3 (V/mV) Large Signal Voltage Gain @+/-5V RL=500 #4 (V/mV) Large Signal Voltage Gain @+/-5V RL=100 #1 (V/mV) Large Signal Voltage Gain @+/-5V RL=100 #2 (V/mV) Large Signal Voltage Gain @+/-5V RL=100 #3 (V/mV) Large Signal Voltage Gain @+/-5V RL=100 #4 (V/mV) Channel Separation @+/-5V 1:2 (dB) Channel Separation @+/-5V 1:3 (dB) Channel Separation @+/-5V 1:4 (dB) Channel Separation @+/-5V 2:1 (dB) Channel Separation @+/-5V 2:3 (dB) An ISO 9001:2008 and DSCC Certified Company 320 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 5.40 5.41 5.42 5.43 5.44 5.45 5.46 5.47 5.48 5.49 5.50 5.51 5.52 5.53 5.54 5.55 5.56 5.57 5.58 5.59 5.60 5.61 5.62 5.63 5.64 5.65 5.66 5.67 5.68 5.69 5.70 5.71 5.72 5.73 5.74 5.75 5.76 5.77 5.78 5.79 5.80 Channel Separation @+/-5V 2:4 (dB) Channel Separation @+/-5V 3:1 (dB) Channel Separation @+/-5V 3:2 (dB) Channel Separation @+/-5V 3:4 (dB) Channel Separation @+/-5V 4:1 (dB) Channel Separation @+/-5V 4:2 (dB) Channel Separation @+/-5V 4:3 (dB) Output Voltage Swing High @+/-5V RL=500 #1 (V) Output Voltage Swing High @+/-5V RL=500 #2 (V) Output Voltage Swing High @+/-5V RL=500 #3 (V) Output Voltage Swing High @+/-5V RL=500 #4 (V) Output Voltage Swing High @+/-5V RL=100 #1 (V) Output Voltage Swing High @+/-5V RL=100 #2 (V) Output Voltage Swing High @+/-5V RL=100 #3 (V) Output Voltage Swing High @+/-5V RL=100 #4 (V) Output Voltage Swing Low @+/-5V RL=500 #1 (V) Output Voltage Swing Low @+/-5V RL=500 #2 (V) Output Voltage Swing Low @+/-5V RL=500 #3 (V) Output Voltage Swing Low @+/-5V RL=500 #4 (V) Output Voltage Swing Low @+/-5V RL=100 #1 (V) Output Voltage Swing Low @+/-5V RL=100 #2 (V) Output Voltage Swing Low @+/-5V RL=100 #3 (V) Output Voltage Swing Low @+/-5V RL=100 #4 (V) Maximum Output Source Current @+/-5V #1 (A) Maximum Output Source Current @+/-5V #2 (A) Maximum Output Source Current @+/-5V #3 (A) Maximum Output Source Current @+/-5V #4 (A) Maximum Output Sink Current @+/-5V #1 (A) Maximum Output Sink Current @+/-5V #2 (A) Maximum Output Sink Current @+/-5V #3 (A) Maximum Output Sink Current @+/-5V #4 (A) Positive Short-Circuit Current @+/-5V #1 (A) Positive Short-Circuit Current @+/-5V #2 (A) Positive Short-Circuit Current @+/-5V #3 (A) Positive Short-Circuit Current @+/-5V #4 (A) Negative Short-Circuit Current @+/-5V #1 (A) Negative Short-Circuit Current @+/-5V #2 (A) Negative Short-Circuit Current @+/-5V #3 (A) Negative Short-Circuit Current @+/-5V #4 (A) Positive Supply Current @5V (A) Negative Supply Current @5V (A) An ISO 9001:2008 and DSCC Certified Company 321 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 5.81 5.82 5.83 5.84 5.85 5.86 5.87 5.88 5.89 5.90 5.91 5.92 5.93 5.94 5.95 5.96 5.97 5.98 5.99 5.100 5.101 5.102 5.103 5.104 5.105 5.106 5.107 5.108 5.109 5.110 5.111 5.112 5.113 5.114 5.115 5.116 5.117 5.118 5.119 5.120 5.121 Input Offset Voltage @5V #1 (V) Input Offset Voltage @5V #2 (V) Input Offset Voltage @5V #3 (V) Input Offset Voltage @5V #4 (V) Input Offset Current @5V #1 (A) Input Offset Current @5V #2 (A) Input Offset Current @5V #3 (A) Input Offset Current @5V #4 (A) Positive Input Bias Current @5V #1 (A) Positive Input Bias Current @5V #2 (A) Positive Input Bias Current @5V #3 (A) Positive Input Bias Current @5V #4 (A) Negative Input Bias Current @5V #1 (A) Negative Input Bias Current @5V #2 (A) Negative Input Bias Current @5V #3 (A) Negative Input Bias Current @5V #4 (A) Common Mode Rejection Ratio @5V #1 (dB) Common Mode Rejection Ratio @5V #2 (dB) Common Mode Rejection Ratio @5V #3 (dB) Common Mode Rejection Ratio @5V #4 (dB) Large Signal Voltage Gain @5V RL=500 #1 (V/mV) Large Signal Voltage Gain @5V RL=500 #2 (V/mV) Large Signal Voltage Gain @5V RL=500 #3 (V/mV) Large Signal Voltage Gain @5V RL=500 #4 (V/mV) Large Signal Voltage Gain @5V RL=100 #1 (V/mV) Large Signal Voltage Gain @5V RL=100 #2 (V/mV) Large Signal Voltage Gain @5V RL=100 #3 (V/mV) Large Signal Voltage Gain @5V RL=100 #4 (V/mV) Channel Separation @5V 1:2 (dB) Channel Separation @5V 1:3 (dB) Channel Separation @5V 1:4 (dB) Channel Separation @5V 2:1 (dB) Channel Separation @5V 2:3 (dB) Channel Separation @5V 2:4 (dB) Channel Separation @5V 3:1 (dB) Channel Separation @5V 3:2 (dB) Channel Separation @5V 3:4 (dB) Channel Separation @5V 4:1 (dB) Channel Separation @5V 4:2 (dB) Channel Separation @5V 4:3 (dB) Output Voltage Swing High @5V RL=500 #1 (V) An ISO 9001:2008 and DSCC Certified Company 322 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800 RLAT Report 10-326 100808 R1.0 5.122 5.123 5.124 5.125 5.126 5.127 5.128 5.129 5.130 5.131 5.132 5.133 5.134 5.135 5.136 5.137 5.138 5.139 5.140 5.141 5.142 5.143 5.144 5.145 5.146 5.147 5.148 5.149 5.150 5.151 5.152 Output Voltage Swing High @5V RL=500 #2 (V) Output Voltage Swing High @5V RL=500 #3 (V) Output Voltage Swing High @5V RL=500 #4 (V) Output Voltage Swing High @5V RL=100 #1 (V) Output Voltage Swing High @5V RL=100 #2 (V) Output Voltage Swing High @5V RL=100 #3 (V) Output Voltage Swing High @5V RL=100 #4 (V) Output Voltage Swing Low @5V RL=500 #1 (V) Output Voltage Swing Low @5V RL=500 #2 (V) Output Voltage Swing Low @5V RL=500 #3 (V) Output Voltage Swing Low @5V RL=500 #4 (V) Output Voltage Swing Low @5V RL=100 #1 (V) Output Voltage Swing Low @5V RL=100 #2 (V) Output Voltage Swing Low @5V RL=100 #3 (V) Output Voltage Swing Low @5V RL=100 #4 (V) Maximum Output Source Current @5V #1 (A) Maximum Output Source Current @5V #2 (A) Maximum Output Source Current @5V #3 (A) Maximum Output Source Current @5V #4 (A) Maximum Output Sink Current @5V #1 (A) Maximum Output Sink Current @5V #2 (A) Maximum Output Sink Current @5V #3 (A) Maximum Output Sink Current @5V #4 (A) Positive Short-Circuit Current @5V #1 (A) Positive Short-Circuit Current @5V #2 (A) Positive Short-Circuit Current @5V #3 (A) Positive Short-Circuit Current @5V #4 (A) Negative Short-Circuit Current @5V #1 (A) Negative Short-Circuit Current @5V #2 (A) Negative Short-Circuit Current @5V #3 (A) Negative Short-Circuit Current @5V #4 (A) An ISO 9001:2008 and DSCC Certified Company 323 Radiation Assured Devices 5017 N. 30th Street Colorado Springs, CO 80919 (719) 531-0800