ELDRS_HDR_RH3080MK_Fab_Lot_H0946850.1_W4.pdf

TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Total Ionizing Dose (TID) Radiation Testing of the RH3080MK Adjustable
Low Dropout Regulator for Linear Technology
Customer: Linear Technology, PO# X59515L
RAD Job Number: 11-314
Part Type Tested: RH3080MK Adjustable Low Dropout Regulator, Linear Technology RH3080MK
SPEC NO. 05-08-5246 REV. 0
Traceability Information: Fab Lot#: H0946850.1 Wfr#: 4, Assembly Lot#: 595474.1 See photograph
of unit under test in Appendix A.
Quantity of Units: 12 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 2
units for control. Serial numbers 82 to 86 were biased during irradiation, serial numbers 87 to 91 were
unbiased during irradiation and serial numbers 118 and 119 were used as control. See Appendix B for
the radiation bias connection table.
Radiation and Electrical Test Increments: 50 to 300rad(Si)/s ionizing radiation with electrical test
increments: pre-irradiation, 5krad(Si), 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by Aeroflex RAD
Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a
168-hour 100°C anneal. Both anneals shall be performed in the same electrical bias condition as the
irradiations. Electrical measurements shall be made following each anneal increment.
Radiation Test Standard: MIL-STD-750E TM1019 and/or MIL-STD-883H TM1019 Condition A and
Linear Technology RH3080MK SPEC NO. 05-08-5246 REV. 0.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS03, Calibration Date: 04-2811, Calibration Due 04-28-12. LTS2100 Family Board, Entity ID FB01. LTS0606A Test Fixture, Entity
ID TF35. RH3080 DUT Board. Test Program: RH3080.SRC
Facility and Radiation Source: Aeroflex RAD’s Longmire Laboratories, Colorado Springs, CO.
Gamma rays provided by JLSA 81-24 Co60 source. Dosimetry performed by Air Ionization Chamber
(AIC) traceable to NIST. Aeroflex RAD's dosimetry has been audited by DSCC and Aeroflex RAD has
been awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and
MIL-STD-750.
High Dose Rate Test Result: PASSED the total ionizing dose characterization
test to the maximum tested dose level of 50krad(Si) with all tested parameters
remaining within their datasheet specifications. Further, the units do not
exhibit ELDRS as defined in MIL-STD-883H, TM 1019.8.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric and interface regions. In discrete devices the bulk of the damage is
frequently manifested as a reduction in the gain and/or breakdown voltage of the device. The damage
will usually anneal with time following the end of the radiation exposure. Due to this annealing, and to
ensure a worst-case test condition MIL-STD-883H TM1019 calls out a dose rate of 50 to 300rad(Si)/s as
Condition A and further specifies that the time from the end of an incremental radiation exposure and
electrical testing shall be 1-hour or less and the total time from the end of one incremental irradiation to
the beginning of the next incremental radiation step should be 2-hours or less. The work described in
this report was performed to meet MIL-STD-883H TM1019 Condition A.
2.0. Radiation Test Apparatus
The total ionizing dose testing described in this final report was performed using the facilities at
Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose
(TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are
held in the base of the irradiator heavily shielded by lead. During the radiation exposures the rod is
raised by an electronic timer/controller and the exposure is performed in air. The dose rate for this
irradiator in this configuration ranges from <1rad(Si)/s to a maximum of approximately 300rad(Si)/s,
determined by the distance from the source. For high-dose rate experiments the bias boards are placed in
a radial fashion equidistant from the raised Co-60 rods with the distance adjusted to provide the required
dose rate. The irradiator calibration is maintained by Aeroflex RAD Longmire Laboratories using air
ionization chamber (AIC) equipment calibrated with traceability to the National Institute of Standards
and Technology (NIST). Figure 2.1 shows a photograph of the JLSA 81-24 Co-60 irradiator at
Aeroflex RAD's Longmire Laboratory facility.
Aeroflex RAD is currently certified by the Defense Supply Center Columbus (DLA) for Laboratory
Suitability under MIL STD 750 and MIL-STD-883H. Additional details regarding Aeroflex RAD
dosimetry for TM1019 Condition A testing are available in Aeroflex RAD's report to DLA entitled:
"Dose Rate Mapping of the J.L. Shepherd and Associates Model 81 Irradiator Installed by Radiation
Assured Devices".
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Aeroflex RAD's high dose rate Co-60 irradiator. The dose rate is obtained by positioning the deviceunder-test at a fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately
300rad(Si)/s close to the rods down to 1rad(Si)/s at a distance of approximately 2-feet.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH3080MK Adjustable Low Dropout Regulator described in this final report were irradiated using
a single-sided supply potential of 3V and with all pins tied to ground, that is biased and unbiased. See
the TID Bias Table in Appendix B for the full bias circuit. In our opinion, this bias circuit satisfies the
requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states
"The bias applied to the test devices shall be selected to produce the greatest radiation induced damage
or the worst-case damage for the intended application, if known. While maximum voltage is often worst
case some bipolar linear device parameters (e.g. input bias current or maximum output load current)
exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 5krad(Si), 10krad(Si), 20krad(Si) and 30krad(Si). Electrical testing occurred within one hour
following the end of each irradiation segment. For intermediate irradiations, the parts were tested and
returned to total dose exposure within two hours from the end of the previous radiation increment.
The TID bias board was positioned in the Co-60 cell to provide the required minimum of 50rad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted."
The final dose rate within the high dose rate lead-aluminum enclosure was determined using calibration
calculations based on air ionization chamber (AIC) dosimetry performed just prior to beginning the total
dose irradiations. The final dose rate for this work was 58.90rad(Si)/s with a precision of ±5%.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the total ionizing dose characterization testing the following electrical parameters were measured
pre- and post-irradiation:
1. SET Pin Current (A) @ Vin=1V Vc=2V IL=1mA
2. Output Offset Voltage (V) @ Vin=1V Vc=2V IL=1mA
3. ISET Line Regulation (nA/V) @ Vc=2 to 26V IL=1mA
4. VOS Line Regulation (mV/V) @ Vc=2 to 26V IL=1mA
5. ISET Load Regulation (A) @ IL=1mA to 100mA
6. VOS Load Regulation (V) @ IL=1mA to 100mA
7. VCONTROL Pin Current (A) @ Vin=1V Vc=2V IL=100mA
8. Minimum Load Current (A) @ Vin=Vc=10V Vo=0.1V
9. Minimum Load Current (A) @ Vin=Vc=26V Vo=0.1V
10. VCONTROL Dropout Voltage (V) @ Vin=1V IL=100mA
11. VIN Dropout Voltage (V) @ Vc=2V IL=100mA
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
Further, MIL-STD-883H, TM 1019.8 Section 3.13.1.1 Characterization test to determine if a part
exhibits ELDRS' states the following: Select a minimum random sample of 21 devices from a
population representative of recent production runs. Smaller sample sizes may be used if agreed upon
between the parties to the test. All of the selected devices shall have undergone appropriate elevated
temperature reliability screens, e.g. burn-in and high temperature storage life. Divide the samples into
four groups of 5 each and use the remaining part for a control. Perform pre-irradiation electrical
characterization on all parts assuring that they meet the Group A electrical tests. Irradiate 5 samples
under a 0 volt bias and another 5 under the irradiation bias given in the acquisition specification at 50300 rad(Si)/s and room temperature. Irradiate 5 samples under a 0 volt bias and another 5 under
irradiation bias given in the acquisition specification at < 10mrad(Si)/s and room temperature. Irradiate
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
all samples to the same dose levels, including 0.5 and 1.0 times the anticipated specification dose, and
repeat the electrical characterization on each part at each dose level. Post irradiation electrical
measurements shall be performed per paragraph 3.10 where the low dose rate test is considered
Condition D. Calculate the radiation induced change in each electrical parameter (Δpara) for each
sample at each radiation level. Calculate the ratio of the median Δpara at low dose rate to the median
Δpara at high dose rate for each irradiation bias group at each total dose level. If this ratio exceeds 1.5
for any of the most sensitive parameters then the part is considered to be ELDRS susceptible. This test
does not apply to parameters which exhibit changes that are within experimental error or whose values
are below the pre-irradiation electrical specification limits at low dose rate at the specification dose.
Therefore, the data in this report can be analyzed along with the high dose rate report titled "Enhanced
Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH3080MK Adjustable Low Dropout
Regulator for Linear Technology" to demonstrate that these parts do not exhibit ELDRS as defined in
the current test method.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. Total Ionizing Dose Test Results
Based on this criterion the RH3080MK Adjustable Low Dropout Regulator (from the lot traceability
information provided on the first page of this test report) PASSED the total ionizing dose test to the
maximum tested dose level of 50krad(Si) with all tested parameters remaining within their datasheet
specifications.
Figures 5.1 through 5.12 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.12 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the upper and/or lower confidence limits, as
determined by KTL statistics, on the sample irradiated in the biased condition while the shaded lines
(solid or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
sample irradiated in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation
minimum and/or maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change during
the anneal.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.1. Plot of SET Pin Current (A) @ Vin=1V Vc=2V IL=1mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.1. Raw data for SET Pin Current (A) @ Vin=1V Vc=2V IL=1mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
SET Pin Current (A) @ Vin=1V Vc=2V IL=1mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
9.974E-06
9.913E-06
1.003E-05
9.915E-06
1.004E-05
9.976E-06
1.004E-05
1.003E-05
1.004E-05
9.975E-06
1.002E-05
1.003E-05
5
9.974E-06
9.913E-06
1.004E-05
9.933E-06
1.004E-05
9.995E-06
1.004E-05
1.004E-05
1.004E-05
9.974E-06
1.001E-05
1.003E-05
9.97E-06
6.05E-08
1.01E-05
9.81E-06
9.98E-06
5.70E-08
1.01E-05
9.82E-06
Total Dose (krad(Si))
10
20
9.974E-06 9.975E-06
9.913E-06 9.913E-06
1.004E-05 1.004E-05
9.962E-06 9.973E-06
1.004E-05 1.004E-05
1.003E-05 1.004E-05
1.004E-05 1.008E-05
1.004E-05 1.004E-05
1.004E-05 1.004E-05
9.974E-06 9.975E-06
1.002E-05 1.002E-05
1.003E-05 1.003E-05
9.98E-06
5.25E-08
1.01E-05
9.84E-06
9.99E-06
5.15E-08
1.01E-05
9.85E-06
24-hr
Anneal
168-hr
Anneal
30
9.975E-06
9.913E-06
1.004E-05
9.973E-06
1.004E-05
1.004E-05
1.009E-05
1.004E-05
1.004E-05
9.975E-06
1.002E-05
1.003E-05
50
9.975E-06
9.913E-06
1.004E-05
9.975E-06
1.004E-05
1.004E-05
1.010E-05
1.004E-05
1.004E-05
9.975E-06
1.002E-05
1.003E-05
70
9.974E-06
9.913E-06
1.004E-05
9.974E-06
1.004E-05
1.004E-05
1.010E-05
1.004E-05
1.004E-05
9.974E-06
1.003E-05
1.003E-05
80
1.004E-05
9.927E-06
1.010E-05
9.974E-06
1.004E-05
1.010E-05
1.016E-05
1.010E-05
1.010E-05
9.974E-06
1.003E-05
1.003E-05
9.99E-06
5.15E-08
1.01E-05
9.85E-06
9.99E-06
5.14E-08
1.01E-05
9.85E-06
9.99E-06
5.20E-08
1.01E-05
9.84E-06
1.00E-05
6.52E-08
1.02E-05
9.84E-06
1.00E-05 1.00E-05 1.00E-05 1.00E-05 1.00E-05 1.00E-05 1.00E-05 1.01E-05
3.17E-08 2.92E-08 2.83E-08 3.77E-08 4.21E-08 4.31E-08 4.35E-08 6.85E-08
1.01E-05 1.01E-05 1.01E-05 1.01E-05 1.02E-05 1.02E-05 1.02E-05 1.03E-05
9.92E-06 9.94E-06 9.95E-06 9.93E-06 9.92E-06 9.92E-06 9.92E-06 9.90E-06
9.90E-06 9.85E-06 9.80E-06 9.80E-06 9.80E-06 9.80E-06 9.80E-06 9.80E-06
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
1.01E-05 1.02E-05 1.02E-05 1.02E-05 1.02E-05 1.03E-05 1.03E-05 1.03E-05
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.2. Plot of Output Offset Voltage (V) @ Vin=1V Vc=2V IL=1mA versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
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TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.2. Raw data for Output Offset Voltage (V) @ Vin=1V Vc=2V IL=1mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Output Offset Voltage (V) @ Vin=1V Vc=2V IL=1mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.33E-03
1.54E-04
4.10E-05
-8.72E-04
-5.10E-04
-6.88E-04
1.32E-04
3.38E-04
-9.49E-04
1.85E-04
-6.04E-04
2.16E-04
5
-1.41E-03
1.59E-04
-5.00E-06
-9.06E-04
-5.31E-04
-6.99E-04
1.11E-04
3.50E-04
-1.03E-03
1.67E-04
-6.05E-04
2.97E-04
Total Dose (krad(Si))
10
20
-1.41E-03 -1.44E-03
1.45E-04 1.15E-04
-1.50E-05 -1.70E-05
-8.93E-04 -9.41E-04
-5.56E-04 -5.86E-04
-7.40E-04 -7.48E-04
7.70E-05 2.70E-05
3.35E-04 3.34E-04
-1.01E-03 -1.04E-03
1.49E-04 1.29E-04
-5.93E-04 -6.14E-04
2.87E-04 2.91E-04
24-hr
Anneal
30
-1.46E-03
9.00E-05
-4.60E-05
-9.47E-04
-5.92E-04
-7.17E-04
2.00E-06
3.22E-04
-1.07E-03
1.12E-04
-6.04E-04
2.87E-04
50
-1.49E-03
7.40E-05
-7.30E-05
-9.75E-04
-6.22E-04
-7.33E-04
-5.90E-05
3.13E-04
-1.10E-03
7.80E-05
-6.04E-04
2.90E-04
70
-1.49E-03
6.80E-05
-7.20E-05
-9.57E-04
-5.89E-04
-7.31E-04
-7.00E-05
3.02E-04
-1.15E-03
5.80E-05
-6.15E-04
2.84E-04
168-hr
Anneal
80
-1.79E-03
-2.18E-04
-3.90E-05
-1.28E-03
-5.42E-04
-1.01E-03
-2.89E-04
9.20E-05
-1.31E-03
-1.39E-04
-5.91E-04
2.88E-04
-5.03E-04 -5.38E-04 -5.47E-04 -5.74E-04 -5.91E-04 -6.17E-04 -6.08E-04 -7.74E-04
6.22E-04 6.44E-04 6.39E-04 6.47E-04 6.40E-04 6.45E-04 6.41E-04 7.39E-04
1.20E-03 1.23E-03 1.21E-03 1.20E-03 1.17E-03 1.15E-03 1.15E-03 1.25E-03
-2.21E-03 -2.30E-03 -2.30E-03 -2.35E-03 -2.35E-03 -2.39E-03 -2.36E-03 -2.80E-03
-1.96E-04
5.80E-04
1.39E-03
-1.79E-03
-5.00E-03
PASS
5.00E-03
PASS
-2.19E-04
6.05E-04
1.44E-03
-1.88E-03
-6.50E-03
PASS
6.50E-03
PASS
-2.37E-04
5.96E-04
1.40E-03
-1.87E-03
-8.00E-03
PASS
8.00E-03
PASS
-2.59E-04
5.97E-04
1.38E-03
-1.90E-03
-8.00E-03
PASS
8.00E-03
PASS
-2.70E-04
5.94E-04
1.36E-03
-1.90E-03
-8.00E-03
PASS
8.00E-03
PASS
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-3.00E-04
5.91E-04
1.32E-03
-1.92E-03
-8.00E-03
PASS
8.00E-03
PASS
-3.18E-04
6.02E-04
1.33E-03
-1.97E-03
-8.00E-03
PASS
8.00E-03
PASS
-5.30E-04
5.97E-04
1.11E-03
-2.17E-03
-8.00E-03
PASS
8.00E-03
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.3. Plot of ISET Line Regulation (nA/V) @ Vc=2 to 26V IL=1mA versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
12
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for ISET Line Regulation (nA/V) @ Vc=2 to 26V IL=1mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
ISET Line Regulation (nA/V) @ Vc=2 to 26V IL=1mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
0.00E+00
-5.00E-02
-2.50E-01
0.00E+00
-2.00E-01
-1.00E-01
-2.00E-01
0.00E+00
0.00E+00
-2.00E-01
1.50E-01
5
0.00E+00
0.00E+00
0.00E+00
-2.00E-01
0.00E+00
-4.60E-01
-1.50E-01
0.00E+00
0.00E+00
0.00E+00
-2.50E-01
-3.10E-01
Total Dose (krad(Si))
10
20
0.00E+00 -5.00E-02
0.00E+00 0.00E+00
0.00E+00 0.00E+00
5.00E-02 0.00E+00
-1.00E-01 -1.00E-01
-5.00E-02 0.00E+00
-5.10E-01 -1.50E-01
0.00E+00 0.00E+00
0.00E+00 0.00E+00
-5.00E-02 -5.00E-02
-5.00E-02 -2.00E-01
0.00E+00 0.00E+00
24-hr
Anneal
30
-5.00E-02
-5.00E-02
-5.00E-02
-5.00E-02
-1.50E-01
0.00E+00
-5.00E-02
0.00E+00
0.00E+00
-5.00E-02
-5.00E-02
3.60E-01
50
-5.00E-02
-5.00E-02
-1.00E-01
0.00E+00
-3.10E-01
0.00E+00
0.00E+00
-5.00E-02
-5.00E-02
-1.50E-01
-2.00E-01
1.50E-01
70
-1.00E-01
-5.00E-02
-1.50E-01
0.00E+00
-4.10E-01
0.00E+00
0.00E+00
-5.00E-02
-1.00E-01
-1.50E-01
5.00E-02
-1.00E-01
168-hr
Anneal
80
0.00E+00
-7.60E-01
5.00E-02
-5.00E-02
-1.00E-01
-1.12E+00
-6.10E-01
-1.07E+00
-5.00E-02
-1.00E-01
8.70E-01
0.00E+00
-6.00E-02 -4.00E-02 -1.00E-02 -3.00E-02 -7.00E-02 -1.02E-01 -1.42E-01 -1.72E-01
1.08E-01 8.94E-02 5.48E-02 4.47E-02 4.47E-02 1.22E-01 1.60E-01 3.33E-01
2.37E-01 2.05E-01 1.40E-01 9.26E-02 5.26E-02 2.31E-01 2.96E-01 7.42E-01
-3.57E-01 -2.85E-01 -1.60E-01 -1.53E-01 -1.93E-01 -4.35E-01 -5.80E-01 -1.09E+00
-1.00E-01
1.00E-01
1.74E-01
-3.74E-01
-4.50E-01
PASS
4.50E-01
PASS
-1.22E-01
2.00E-01
4.26E-01
-6.70E-01
-6.25E-01
PASS
6.25E-01
PASS
-1.22E-01
2.18E-01
4.77E-01
-7.21E-01
-8.00E-01
PASS
8.00E-01
PASS
-4.00E-02
6.52E-02
1.39E-01
-2.19E-01
-8.00E-01
PASS
8.00E-01
PASS
-2.00E-02
2.74E-02
5.51E-02
-9.51E-02
-8.33E-01
PASS
8.33E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
13
-5.00E-02
6.12E-02
1.18E-01
-2.18E-01
-9.00E-01
PASS
9.00E-01
PASS
-6.00E-02
6.52E-02
1.19E-01
-2.39E-01
-9.00E-01
PASS
9.00E-01
PASS
-5.90E-01
5.11E-01
8.10E-01
-1.99E+00
-9.00E-01
PASS
9.00E-01
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.4. Plot of VOS Line Regulation (mV/V) @ Vc=2 to 26V IL=1mA versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
14
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for VOS Line Regulation (mV/V) @ Vc=2 to 26V IL=1mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
VOS Line Regulation (mV/V) @ Vc=2 to 26V IL=1mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
1.00E-03
0.00E+00
3.00E-03
3.00E-03
1.00E-03
3.00E-03
0.00E+00
2.00E-03
-4.00E-03
0.00E+00
1.00E-03
2.00E-03
5
0.00E+00
0.00E+00
3.00E-03
3.00E-03
1.00E-03
3.00E-03
0.00E+00
2.00E-03
2.00E-03
0.00E+00
1.00E-03
2.00E-03
Total Dose (krad(Si))
10
20
0.00E+00 0.00E+00
0.00E+00 0.00E+00
2.00E-03 2.00E-03
3.00E-03 2.00E-03
0.00E+00 0.00E+00
2.00E-03 2.00E-03
0.00E+00 0.00E+00
2.00E-03 2.00E-03
3.00E-03 3.00E-03
0.00E+00 0.00E+00
2.00E-03 1.00E-03
2.00E-03 2.00E-03
24-hr
Anneal
30
0.00E+00
-1.00E-03
1.00E-03
2.00E-03
0.00E+00
3.00E-03
-1.00E-03
2.00E-03
3.00E-03
0.00E+00
2.00E-03
2.00E-03
50
0.00E+00
-2.00E-03
0.00E+00
1.00E-03
0.00E+00
3.00E-03
-2.00E-03
2.00E-03
3.00E-03
-1.00E-03
1.00E-03
2.00E-03
70
0.00E+00
-1.00E-03
0.00E+00
2.00E-03
0.00E+00
3.00E-03
-2.00E-03
2.00E-03
2.00E-03
-1.00E-03
1.00E-03
2.00E-03
168-hr
Anneal
80
-3.00E-03
-3.00E-03
0.00E+00
0.00E+00
1.00E-03
-4.00E-03
-1.00E-02
-3.00E-03
0.00E+00
-1.20E-02
2.00E-03
2.00E-03
1.60E-03 1.40E-03 1.00E-03 8.00E-04 4.00E-04 -2.00E-04 2.00E-04 -1.00E-03
1.34E-03 1.52E-03 1.41E-03 1.10E-03 1.14E-03 1.10E-03 1.10E-03 1.87E-03
5.28E-03 5.56E-03 4.88E-03 3.80E-03 3.53E-03 2.80E-03 3.20E-03 4.13E-03
-2.08E-03 -2.76E-03 -2.88E-03 -2.20E-03 -2.73E-03 -3.20E-03 -2.80E-03 -6.13E-03
2.00E-04
2.68E-03
7.56E-03
-7.16E-03
-5.00E-02
PASS
5.00E-02
PASS
1.40E-03
1.34E-03
5.08E-03
-2.28E-03
-5.50E-02
PASS
5.50E-02
PASS
1.40E-03
1.34E-03
5.08E-03
-2.28E-03
-6.00E-02
PASS
6.00E-02
PASS
1.40E-03
1.34E-03
5.08E-03
-2.28E-03
-8.00E-02
PASS
8.00E-02
PASS
1.40E-03
1.82E-03
6.38E-03
-3.58E-03
-8.67E-02
PASS
8.67E-02
PASS
An ISO 9001:2008 and DSCC Certified Company
15
1.00E-03
2.35E-03
7.43E-03
-5.43E-03
-1.00E-01
PASS
1.00E-01
PASS
8.00E-04
2.17E-03
6.74E-03
-5.14E-03
-1.00E-01
PASS
1.00E-01
PASS
-5.80E-03
5.02E-03
7.96E-03
-1.96E-02
-1.00E-01
PASS
1.00E-01
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.5. Plot of ISET Load Regulation (A) @ IL=1mA to 100mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for ISET Load Regulation (A) @ IL=1mA to 100mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
ISET Load Regulation (A) @ IL=1mA to 100mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
0.00E+00
0.00E+00
-3.67E-09
0.00E+00
-3.67E-09
-1.22E-09
-6.11E-09
0.00E+00
0.00E+00
-6.11E-09
-2.44E-09
5
0.00E+00
0.00E+00
0.00E+00
-7.33E-09
-1.22E-09
6.11E-09
-4.89E-09
0.00E+00
0.00E+00
0.00E+00
-6.11E-09
-4.89E-09
Total Dose (krad(Si))
10
20
0.00E+00 -1.22E-09
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 1.22E-09
0.00E+00 -1.22E-09
7.33E-09 0.00E+00
-4.89E-09 6.11E-09
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
1.22E-09 0.00E+00
-2.44E-09 -1.22E-09
24-hr
Anneal
30
0.00E+00
0.00E+00
0.00E+00
-1.22E-09
-2.44E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.22E-09
-1.22E-09
2.44E-09
50
-1.22E-09
0.00E+00
-1.22E-09
0.00E+00
-4.89E-09
0.00E+00
0.00E+00
0.00E+00
0.00E+00
-1.22E-09
0.00E+00
2.44E-09
70
0.00E+00
-1.22E-09
-1.22E-09
0.00E+00
-1.22E-09
0.00E+00
0.00E+00
0.00E+00
-1.22E-09
-2.44E-09
1.22E-09
-2.44E-09
168-hr
Anneal
80
0.00E+00
0.00E+00
0.00E+00
-1.22E-09
-2.44E-09
0.00E+00
0.00E+00
-2.44E-09
-1.22E-09
-1.22E-09
-3.67E-09
3.67E-09
-7.34E-10 -1.71E-09 0.00E+00 -2.44E-10 -7.32E-10 -1.47E-09 -7.32E-10 -7.32E-10
1.64E-09 3.19E-09 0.00E+00 1.02E-09 1.09E-09 2.01E-09 6.68E-10 1.09E-09
3.77E-09 7.03E-09 0.00E+00 2.55E-09 2.26E-09 4.04E-09 1.10E-09 2.26E-09
-5.23E-09 -1.04E-08 0.00E+00 -3.04E-09 -3.72E-09 -6.97E-09 -2.56E-09 -3.72E-09
-2.20E-09
2.65E-09
5.07E-09
-9.47E-09
-1.50E-08
PASS
1.50E-08
PASS
2.44E-10
3.90E-09
1.09E-08
-1.05E-08
-1.50E-08
PASS
1.50E-08
PASS
4.88E-10
4.37E-09
1.25E-08
-1.15E-08
-1.50E-08
PASS
1.50E-08
PASS
1.22E-09
2.73E-09
8.71E-09
-6.27E-09
-1.50E-08
PASS
1.50E-08
PASS
-2.44E-10
5.46E-10
1.25E-09
-1.74E-09
-1.83E-08
PASS
1.83E-08
PASS
An ISO 9001:2008 and DSCC Certified Company
17
-2.44E-10
5.46E-10
1.25E-09
-1.74E-09
-2.50E-08
PASS
2.50E-08
PASS
-7.32E-10
1.09E-09
2.26E-09
-3.72E-09
-2.50E-08
PASS
2.50E-08
PASS
-9.76E-10
1.02E-09
1.82E-09
-3.77E-09
-2.50E-08
PASS
2.50E-08
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.6. Plot of VOS Load Regulation (V) @ IL=1mA to 100mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for VOS Load Regulation (V) @ IL=1mA to 100mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
VOS Load Regulation (V) @ IL=1mA to 100mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.80E-04
-1.84E-04
-1.71E-04
-1.81E-04
-1.83E-04
-1.75E-04
-1.77E-04
-1.78E-04
-1.65E-04
-1.80E-04
-1.82E-04
-1.92E-04
5
-1.93E-04
-1.87E-04
-1.80E-04
-1.91E-04
-1.90E-04
-1.70E-04
-1.91E-04
-1.79E-04
-1.74E-04
-1.86E-04
-1.84E-04
-1.80E-04
Total Dose (krad(Si))
10
20
-1.88E-04 -1.98E-04
-1.91E-04 -1.93E-04
-1.77E-04 -1.79E-04
-1.81E-04 -1.90E-04
-1.92E-04 -1.90E-04
-1.80E-04 -1.80E-04
-1.95E-04 -1.86E-04
-1.71E-04 -1.72E-04
-1.73E-04 -1.78E-04
-1.89E-04 -2.00E-04
-1.79E-04 -1.81E-04
-1.79E-04 -1.83E-04
24-hr
Anneal
30
-1.90E-04
-1.97E-04
-1.84E-04
-1.86E-04
-1.90E-04
-1.85E-04
-1.93E-04
-1.87E-04
-1.81E-04
-1.76E-04
-1.80E-04
-1.81E-04
50
-1.89E-04
-1.93E-04
-1.91E-04
-1.93E-04
-2.00E-04
-1.74E-04
-1.96E-04
-1.82E-04
-1.90E-04
-1.93E-04
-1.81E-04
-1.82E-04
70
-1.94E-04
-2.01E-04
-1.92E-04
-1.94E-04
-1.96E-04
-1.78E-04
-1.94E-04
-1.86E-04
-1.87E-04
-2.03E-04
-1.84E-04
-1.80E-04
168-hr
Anneal
80
-2.04E-04
-2.01E-04
-1.92E-04
-2.00E-04
-1.95E-04
-1.99E-04
-1.96E-04
-1.98E-04
-1.94E-04
-1.91E-04
-1.68E-04
-1.81E-04
-1.80E-04 -1.88E-04 -1.86E-04 -1.90E-04 -1.89E-04 -1.93E-04 -1.95E-04 -1.98E-04
5.17E-06 5.07E-06 6.53E-06 6.96E-06 4.98E-06 4.15E-06 3.44E-06 4.83E-06
-1.66E-04 -1.74E-04 -1.68E-04 -1.71E-04 -1.76E-04 -1.82E-04 -1.86E-04 -1.85E-04
-1.94E-04 -2.02E-04 -2.04E-04 -2.09E-04 -2.03E-04 -2.05E-04 -2.05E-04 -2.12E-04
-1.75E-04
5.87E-06
-1.59E-04
-1.91E-04
-1.00E-03
PASS
1.00E-03
PASS
-1.80E-04
8.57E-06
-1.56E-04
-2.04E-04
-1.13E-03
PASS
1.13E-03
PASS
-1.82E-04
1.03E-05
-1.53E-04
-2.10E-04
-1.25E-03
PASS
1.25E-03
PASS
-1.83E-04
1.06E-05
-1.54E-04
-2.12E-04
-1.30E-03
PASS
1.30E-03
PASS
-1.84E-04
6.39E-06
-1.67E-04
-2.02E-04
-1.32E-03
PASS
1.32E-03
PASS
An ISO 9001:2008 and DSCC Certified Company
19
-1.87E-04
8.94E-06
-1.62E-04
-2.12E-04
-1.35E-03
PASS
1.35E-03
PASS
-1.90E-04
9.40E-06
-1.64E-04
-2.15E-04
-1.35E-03
PASS
1.35E-03
PASS
-1.96E-04
3.21E-06
-1.87E-04
-2.04E-04
-1.35E-03
PASS
1.35E-03
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.7. Plot of VCONTROL Pin Current (A) @ Vin=1V Vc=2V IL=100mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for VCONTROL Pin Current (A) @ Vin=1V Vc=2V IL=100mA versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
VCONTROL Pin Current (A) @ Vin=1V Vc=2V IL=100mA
Total Dose (krad(Si))
Device
0
5
10
20
30
50
82 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
83 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
84 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
85 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
86 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
87 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.39E-03
88 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
89 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
90 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
91 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
118 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
119 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.39E-03
Biased Statistics
Average Biased
4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
Std Dev Biased
0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 1.10E-06
Ps90%/90% (+KTL) Biased
4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.52E-03
Ps90%/90% (-KTL) Biased
4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03
Un-Biased Statistics
Average Un-Biased
4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.49E-03
Std Dev Un-Biased
0.00E+00 0.00E+00 0.00E+00 0.00E+00 0.00E+00 5.50E-05
Ps90%/90% (+KTL) Un-Biased
4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.64E-03
Ps90%/90% (-KTL) Un-Biased
4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.51E-03 4.34E-03
Specification MAX
5.30E-03 5.30E-03 5.30E-03 5.30E-03 5.30E-03 5.30E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
21
24-hr
Anneal
168-hr
Anneal
70
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
80
4.26E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.02E-03
4.26E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
4.51E-03
0.00E+00
4.51E-03
4.51E-03
4.46E-03
1.10E-04
4.76E-03
4.16E-03
4.51E-03 4.36E-03
0.00E+00 2.19E-04
4.51E-03 4.96E-03
4.51E-03 3.76E-03
5.30E-03 5.30E-03
PASS
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.8. Plot of Minimum Load Current (A) @ Vin=Vc=10V Vo=0.1V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for Minimum Load Current (A) @ Vin=Vc=10V Vo=0.1V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Minimum Load Current (A) @ Vin=Vc=10V Vo=0.1V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
5
10
20
30
50
70
80
82 3.71E-04 3.71E-04 3.72E-04 3.72E-04 3.71E-04 3.71E-04 3.72E-04 3.72E-04
83 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04
84 3.71E-04 3.71E-04 3.72E-04 3.71E-04 3.71E-04 3.71E-04 3.72E-04 3.71E-04
85 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04
86 3.72E-04 3.72E-04 3.71E-04 3.72E-04 3.72E-04 3.71E-04 3.72E-04 3.71E-04
87 3.71E-04 3.71E-04 3.72E-04 3.71E-04 3.72E-04 3.71E-04 3.71E-04 3.72E-04
88 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.72E-04 3.72E-04
89 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.72E-04
90 3.72E-04 3.71E-04 3.71E-04 3.72E-04 3.72E-04 3.72E-04 3.72E-04 3.72E-04
91 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04
118 3.71E-04 3.71E-04 3.71E-04 3.72E-04 3.71E-04 3.71E-04 3.72E-04 3.71E-04
119 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04
Biased Statistics
Average Biased
3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.72E-04 3.71E-04
Std Dev Biased
4.47E-07 4.47E-07 5.48E-07 5.48E-07 4.47E-07 0.00E+00 5.48E-07 4.47E-07
Ps90%/90% (+KTL) Biased
3.72E-04 3.72E-04 3.73E-04 3.73E-04 3.72E-04 3.71E-04 3.73E-04 3.72E-04
Ps90%/90% (-KTL) Biased
3.70E-04 3.70E-04 3.70E-04 3.70E-04 3.70E-04 3.71E-04 3.70E-04 3.70E-04
Un-Biased Statistics
Average Un-Biased
3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.71E-04 3.72E-04
Std Dev Un-Biased
4.47E-07 0.00E+00 4.47E-07 4.47E-07 5.48E-07 4.47E-07 5.48E-07 4.47E-07
Ps90%/90% (+KTL) Un-Biased
3.72E-04 3.71E-04 3.72E-04 3.72E-04 3.73E-04 3.72E-04 3.73E-04 3.73E-04
Ps90%/90% (-KTL) Un-Biased
3.70E-04 3.71E-04 3.70E-04 3.70E-04 3.70E-04 3.70E-04 3.70E-04 3.71E-04
Specification MAX
4.00E-04 4.00E-04 4.00E-04 4.00E-04 4.00E-04 4.00E-04 4.00E-04 4.00E-04
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
23
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.9. Plot of Minimum Load Current (A) @ Vin=Vc=26V Vo=0.1V versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on
the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
24
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for Minimum Load Current (A) @ Vin=Vc=26V Vo=0.1V versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Minimum Load Current (A) @ Vin=Vc=26V Vo=0.1V
Total Dose (krad(Si))
Anneal
Anneal
Device
0
5
10
20
30
50
70
80
82 4.47E-04 4.47E-04 4.47E-04 4.47E-04 4.47E-04 4.47E-04 4.47E-04 4.47E-04
83 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04
84 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.56E-04 4.55E-04 4.55E-04
85 4.55E-04 4.56E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.56E-04
86 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.73E-04 4.56E-04
87 4.55E-04 4.55E-04 4.56E-04 4.56E-04 4.55E-04 4.56E-04 4.55E-04 4.73E-04
88 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.56E-04 4.56E-04 4.73E-04
89 4.47E-04 4.55E-04 4.56E-04 4.55E-04 4.55E-04 4.47E-04 4.55E-04 4.55E-04
90 4.47E-04 4.56E-04 4.56E-04 4.55E-04 4.56E-04 4.56E-04 4.56E-04 4.56E-04
91 4.55E-04 4.55E-04 4.56E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04
118 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.72E-04 4.72E-04
119 4.72E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04 4.55E-04
Biased Statistics
Average Biased
4.57E-04 4.57E-04 4.57E-04 4.57E-04 4.57E-04 4.57E-04 4.57E-04 4.54E-04
Std Dev Biased
9.18E-06 9.14E-06 9.18E-06 9.18E-06 9.18E-06 9.14E-06 9.59E-06 3.83E-06
Ps90%/90% (+KTL) Biased
4.82E-04 4.82E-04 4.82E-04 4.82E-04 4.82E-04 4.82E-04 4.83E-04 4.64E-04
Ps90%/90% (-KTL) Biased
4.32E-04 4.32E-04 4.32E-04 4.32E-04 4.32E-04 4.32E-04 4.31E-04 4.43E-04
Un-Biased Statistics
Average Un-Biased
4.52E-04 4.55E-04 4.56E-04 4.55E-04 4.55E-04 4.54E-04 4.55E-04 4.62E-04
Std Dev Un-Biased
4.38E-06 4.47E-07 4.47E-07 4.47E-07 4.47E-07 3.94E-06 5.48E-07 9.69E-06
Ps90%/90% (+KTL) Un-Biased
4.64E-04 4.56E-04 4.57E-04 4.56E-04 4.56E-04 4.65E-04 4.57E-04 4.89E-04
Ps90%/90% (-KTL) Un-Biased
4.40E-04 4.54E-04 4.55E-04 4.54E-04 4.54E-04 4.43E-04 4.54E-04 4.36E-04
Specification MAX
9.00E-04 9.00E-04 9.00E-04 9.00E-04 9.00E-04 9.00E-04 9.00E-04 9.00E-04
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
25
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.10. Plot of VCONTROL Dropout Voltage (V) @ Vin=1V IL=100mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL
statistics, on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper
and/or lower confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased
condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification
value as defined in the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for VCONTROL Dropout Voltage (V) @ Vin=1V IL=100mA versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
VCONTROL Dropout Voltage (V) @ Vin=1V IL=100mA
Device
82
83
84
85
86
87
88
89
90
91
118
119
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MAX
Status
0
1.21E+00
1.22E+00
1.20E+00
1.22E+00
1.22E+00
1.23E+00
1.24E+00
1.24E+00
1.21E+00
1.20E+00
1.20E+00
1.20E+00
5
1.21E+00
1.22E+00
1.20E+00
1.22E+00
1.22E+00
1.22E+00
1.24E+00
1.24E+00
1.20E+00
1.20E+00
1.20E+00
1.20E+00
Total Dose (krad(Si))
10
20
1.21E+00 1.22E+00
1.22E+00 1.22E+00
1.20E+00 1.21E+00
1.22E+00 1.21E+00
1.22E+00 1.22E+00
1.22E+00 1.22E+00
1.24E+00 1.24E+00
1.23E+00 1.24E+00
1.20E+00 1.20E+00
1.20E+00 1.21E+00
1.20E+00 1.20E+00
1.20E+00 1.21E+00
24-hr
Anneal
30
1.21E+00
1.22E+00
1.21E+00
1.22E+00
1.22E+00
1.23E+00
1.24E+00
1.23E+00
1.21E+00
1.21E+00
1.20E+00
1.20E+00
50
1.22E+00
1.22E+00
1.21E+00
1.22E+00
1.22E+00
1.23E+00
1.24E+00
1.23E+00
1.21E+00
1.20E+00
1.20E+00
1.20E+00
70
1.22E+00
1.22E+00
1.20E+00
1.21E+00
1.22E+00
1.22E+00
1.25E+00
1.23E+00
1.21E+00
1.20E+00
1.20E+00
1.20E+00
168-hr
Anneal
80
1.24E+00
1.23E+00
1.22E+00
1.23E+00
1.23E+00
1.25E+00
1.26E+00
1.26E+00
1.23E+00
1.21E+00
1.21E+00
1.20E+00
1.22E+00 1.21E+00 1.21E+00 1.22E+00 1.22E+00 1.22E+00 1.22E+00 1.23E+00
8.60E-03 8.41E-03 7.68E-03 3.78E-03 6.66E-03 6.26E-03 7.57E-03 7.20E-03
1.24E+00 1.24E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.24E+00 1.25E+00
1.19E+00 1.19E+00 1.19E+00 1.21E+00 1.20E+00 1.20E+00 1.19E+00 1.21E+00
1.22E+00
1.69E-02
1.27E+00
1.18E+00
1.40E+00
PASS
1.22E+00
1.90E-02
1.27E+00
1.17E+00
1.45E+00
PASS
1.22E+00
1.75E-02
1.27E+00
1.17E+00
1.50E+00
PASS
1.22E+00
1.73E-02
1.27E+00
1.17E+00
1.50E+00
PASS
1.22E+00
1.64E-02
1.27E+00
1.18E+00
1.52E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
27
1.22E+00
1.70E-02
1.27E+00
1.18E+00
1.55E+00
PASS
1.22E+00
1.67E-02
1.27E+00
1.18E+00
1.55E+00
PASS
1.24E+00
1.90E-02
1.29E+00
1.19E+00
1.55E+00
PASS
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 5.11. Plot of VIN Dropout Voltage (V) @ Vc=2V IL=100mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the upper and/or lower confidence limits, as determined by KTL statistics, on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the upper and/or lower
confidence limits, as determined by KTL statistics, on the samples irradiated in the unbiased condition. The red
dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
28
TID Report
11-314 11/14/14 R1.3
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for VIN Dropout Voltage (V) @ Vc=2V IL=100mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
VIN Dropout Voltage (V) @ Vc=2V IL=100mA
Total Dose (krad(Si))
Anneal
Anneal
Device
0
5
10
20
30
50
70
80
82 7.30E-02 7.40E-02 7.40E-02 7.60E-02 7.70E-02 7.90E-02 7.80E-02 8.10E-02
83 7.40E-02 7.40E-02 7.50E-02 7.60E-02 7.80E-02 8.00E-02 7.90E-02 8.00E-02
84 7.30E-02 7.40E-02 7.40E-02 7.70E-02 7.80E-02 8.00E-02 8.00E-02 8.10E-02
85 7.40E-02 7.40E-02 7.50E-02 7.60E-02 7.70E-02 7.80E-02 7.80E-02 8.00E-02
86 7.20E-02 7.40E-02 7.40E-02 7.60E-02 7.70E-02 7.80E-02 7.80E-02 7.70E-02
87 7.30E-02 7.40E-02 7.40E-02 7.50E-02 7.50E-02 7.60E-02 7.70E-02 8.70E-02
88 7.30E-02 7.40E-02 7.40E-02 7.50E-02 7.60E-02 7.70E-02 7.60E-02 8.80E-02
89 7.40E-02 7.40E-02 7.50E-02 7.60E-02 7.70E-02 7.60E-02 7.80E-02 8.80E-02
90 7.40E-02 7.40E-02 7.50E-02 7.70E-02 7.70E-02 7.80E-02 7.80E-02 8.70E-02
91 7.30E-02 7.40E-02 7.40E-02 7.50E-02 7.50E-02 7.60E-02 7.60E-02 7.80E-02
118 7.30E-02 7.40E-02 7.30E-02 7.20E-02 7.30E-02 7.30E-02 7.30E-02 7.30E-02
119 7.20E-02 7.20E-02 7.20E-02 7.30E-02 7.20E-02 7.20E-02 7.20E-02 7.20E-02
Biased Statistics
Average Biased
7.32E-02 7.40E-02 7.44E-02 7.62E-02 7.74E-02 7.90E-02 7.86E-02 7.98E-02
Std Dev Biased
8.37E-04 0.00E+00 5.48E-04 4.47E-04 5.48E-04 1.00E-03 8.94E-04 1.64E-03
Ps90%/90% (+KTL) Biased
7.55E-02 7.40E-02 7.59E-02 7.74E-02 7.89E-02 8.17E-02 8.11E-02 8.43E-02
Ps90%/90% (-KTL) Biased
7.09E-02 7.40E-02 7.29E-02 7.50E-02 7.59E-02 7.63E-02 7.61E-02 7.53E-02
Un-Biased Statistics
Average Un-Biased
7.34E-02 7.40E-02 7.44E-02 7.56E-02 7.60E-02 7.66E-02 7.70E-02 8.56E-02
Std Dev Un-Biased
5.48E-04 0.00E+00 5.48E-04 8.94E-04 1.00E-03 8.94E-04 1.00E-03 4.28E-03
Ps90%/90% (+KTL) Un-Biased
7.49E-02 7.40E-02 7.59E-02 7.81E-02 7.87E-02 7.91E-02 7.97E-02 9.73E-02
Ps90%/90% (-KTL) Un-Biased
7.19E-02 7.40E-02 7.29E-02 7.31E-02 7.33E-02 7.41E-02 7.43E-02 7.39E-02
Specification MAX
1.70E-01 1.85E-01 2.00E-01 2.10E-01 2.17E-01 2.30E-01 2.30E-01 2.30E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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6.0. Summary / Conclusions
The total ionizing dose testing described in this final report was performed using the facilities at
Aeroflex RAD's Longmire Laboratories in Colorado Springs, CO. The high dose rate total ionizing dose
(TID) source is a JLSA 81-24 irradiator modified to provide a panoramic exposure. The Co-60 rods are
held in the base of the irradiator heavily shielded by lead, during the radiation exposures the rod is raised
by an electronic timer/controller and the exposure is performed in air. The dose rate for this irradiator in
this configuration ranges from <1rad(Si)/s to a maximum of approximately 300rad(Si)/s, determined by
the distance from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the total ionizing dose test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
Based on this criterion the RH3080MK Adjustable Low Dropout Regulator (from the lot traceability
information provided on the first page of this test report) PASSED the total ionizing dose test to the
maximum tested dose level of 50krad(Si) with all tested parameters remaining within their datasheet
specifications. Further, the data in this report can be analyzed along with the low dose rate report titled
"Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the RH3080MK Adjustable Low
Dropout Regulator for Linear Technology" to demonstrate that these parts do not exhibit ELDRS as
defined in MIL-STD-883H, TM 1019.8.
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TID Report
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Aeroflex RAD
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Colorado Springs, CO 80919
(719) 531-0800
Appendix A: Photograph of a Sample Unit-Under-Test to Show Part Traceability
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TID Report
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Aeroflex RAD
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Colorado Springs, CO 80919
(719) 531-0800
Appendix B: Radiation Bias Connections
TID Radiation Biased Conditions: Extracted from Linear Technology RH3080MK SPEC NO. 05-085246 REV. 0.
Pin
Function
Connection / Bias
1
NC
NC
2
SET
To GND via 49.9kΩ
3
V CONTROL To Pin 4
+3V
IN
To GND via 1µF
To Pin 3
To GND via 10µF
OUT
To GND via 499Ω
4
5
Figure B.1. Irradiation bias circuit. This figure was extracted from Linear Technology RH3080MK SPEC NO.
05-08-5246 REV. 0.
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TID Radiation Unbiased Conditions:
Pin
Function
Connection / Bias
1
NC
GND
2
SET
GND
3
V CONTROL GND
4
IN
GND
CASE OUT
GND
Absolute Maximum Rating:
Parameter
Max Rating
V CONTROL Pin Voltage
40V, -0.3V
IN Pin Voltage
40V, -0.3V
SET Pin Current
±10mA
SET Pin Voltage (Relative to OUT) ±0.3V
Figure B.2. K package drawing (for reference only). This figure was extracted from the Linear Technology
RH3080MK SPEC NO. 05-08-5246 REV. 0.
BOTTOM VIEW
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TID Report
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Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
RH3080MK SPEC NO. 05-08-5246 REV. 0. All electrical tests for this device are performed on one of
Aeroflex RAD’s LTS2020 Test Systems. The LTS2020 Test System is a programmable parametric
tester that provides parameter measurements for a variety of digital, analog and mixed signal products
including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020 Test
System achieves accuracy and sensitivity through the use of software self-calibration and an internal
relay matrix with separate family boards and custom personality adapter boards. The tester uses this
relay matrix to connect the required test circuits, select the appropriate voltage / current sources and
establish the needed measurement loops for all the tests performed. The measured parameters and test
conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020
for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table
C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between
tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90
KTL statistics were applied to the measured standard deviation to generate the final measurement range.
This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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Table C.1. Measured parameters and test conditions for the RH3080MK Adjustable Low Dropout Regulator.
Parameter
Symbol
Test Conditions
SET Pin Current (A)
ISET
Vin=1V Vc=2V IL=1mA
Output Offset Voltage (V)
VOS
Vin=1V Vc=2V IL=1mA
ISET Line Regulation (nA/V)
ISET LN REG
Vc=2 to 26V IL=1mA
VOS Line Regulation (mV/V)
VOS LN REG
Vc=2 to 26V IL=1mA
ISET Load Regulation (A)
ISET LOAD REG
IL=1mA to 100mA
VOS Load Regulation (V)
VOS LOAD REG
IL=1mA to 100mA
VCONTROL Pin Current (A)
ICONTROL
Vin=1V Vc=2V IL=100mA
Minimum Load Current (A)
IMIN
VP=VC=10V VO=0.1V
VP=VC=26V VO=0.1V
VCONTROL Dropout Voltage (V)
VC DROPOUT
Vin=1V IL=100mA
VIN Dropout Voltage (V)
VP DROPOUT
Vc=2V IL=100mA
Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH3080MK
Adjustable Low Dropout Regulator.
Pre-Irradiation Specification
Parameter
Measurement Precision/Resolution
MIN
MAX
ISET
9.90E-06
1.01E-05
±6.69E-09
VOS
-5.00E-03
5.00E-03
±5.94E-06
ISET LN REG
-4.50E-01
4.50E-01
±3.25E-01
VOS LN REG
-5.00E-02
5.00E-02
±1.00E-03
ISET LOAD REG
-1.50E-08
1.50E-08
±7.75E-09
VOS LOAD REG
-1.00E-03
1.00E-03
±3.29E-06
ICONTROL
5.30E-03
±0.00E+00
IMIN (VP=VC=10V)
4.00E-04
±8.00E-06
IMIN (VP=VC=26V)
9.00E-04
±8.00E-06
VC DROPOUT
1.40E+00
±4.51E-03
VP DROPOUT
1.70E-01
±8.71E-04
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Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
SET Pin Current (A) @ Vin=1V Vc=2V IL=1mA
Output Offset Voltage (V) @ Vin=1V Vc=2V IL=1mA
ISET Line Regulation (nA/V) @ Vc=2 to 26V IL=1mA
VOS Line Regulation (mV/V) @ Vc=2 to 26V IL=1mA
ISET Load Regulation (A) @ IL=1mA to 100mA
VOS Load Regulation (V) @ IL=1mA to 100mA
VCONTROL Pin Current (A) @ Vin=1V Vc=2V IL=100mA
Minimum Load Current (A) @ Vin=Vc=10V Vo=0.1V
Minimum Load Current (A) @ Vin=Vc=26V Vo=0.1V
VCONTROL Dropout Voltage (V) @ Vin=1V IL=100mA
VIN Dropout Voltage (V) @ Vc=2V IL=100mA
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