FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16750 Generic Copy Issue Date: 05-Dec-2011 TITLE: Additional Wafer Capacity Expansion at ON Semiconductor (Roznov, Czech Republic) PROPOSED FIRST SHIP DATE: 05-Mar-2012 AFFECTED CHANGE CATEGORY(S): Wafer Fabrication AFFECTED PRODUCT DIVISION: PowerFET Business Unit FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or Larry DeLuca<[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office or Brian Goodburn < [email protected] > ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Donna Scheuch< [email protected] > NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: ON Semiconductor plans to consolidate their manufacturing efforts by closing their Wafer facility in Aizu, Japan. This Aizu facility has been the source for our High Cell Density (TMOS7 and HD+) MOSFET Die. These MOSFET Die types are currently being transferred, and will be sourced from the ON Semiconductor’s Wafer facility in Roznov, Czech Republic. Reliability Qualification and full electrical characterization over temperature have been performed. Issue Date: 05-Dec-2011 Rev. 06-Jan-2010 Page 1 of 3 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16750 RELIABILITY DATA SUMMARY: Product built with TMOS7 Silicon Platform Die: Reliability Test Results Test Test Conditions Read points MMBF170L NTMD6601 NTD3055 NTD20P06L 1 AC-PC Ta = 121°C/ 100% RH/ 15psig 96hrs 0/80 0/80 0/80 0/80 2 HASTPC 130°C/85% RH for 96 hrs 96hrs 0/80 0/80 0/80 0/80 3 HTGB 1008 Hrs 0/80 0/80 0/160 0/80 4 HTRB 1008 Hrs 0/80 0/80 0/160 0/80 0/80 0/80 0/80 0/80 0/80 0/80 0/80 0/80 5 IOL 6 TC-PC TA = Max rated for 1008 hrs Vgs=100% of max rated TA = Max rated for 1008 hrs Vds=80% of max rated Ta=25'C, delta Tj=100'C, 2min on/off, 15K- cy -55°C to +150°C 15,000 Cyc 1000 Cycles Product built with HD+ Silicon Platform Die: Reliability Test Results Test Test Conditions Read points NTS4001NT 1G NTJD1155L NCV8401 NCV8403 1 AC-PC Ta = 121°C/ 100% RH/ 15psig 96hrs 0/80 0/80 0/160 0/80 2 HASTPC 130°C/85% RH for 96 hrs 96hrs 0/80 0/80 0/160 0/80 1008 Hrs 0/80 0/80 1008 Hrs 0/80 0/80 0/160 0/80 0/80 0/80 0/160 0/80 0/80 0/80 0/160 0/80 0/80 0/80 0/160 0/80 TA = Max rated for 1008 hrs Vgs=100% of max rated TA = Max rated for 1008 hrs Vds=80% of max rated Ta=25'C, delta Tj=100'C, 2min on/off, 15K- cy 3 HTGB 4 HTRB 5 IOL 6 TC-PC -55°C to +150° 7 HTOL Tj = 125°C 15,000 Cyc 1000 Cycles 1008 Hrs ELECTRICAL CHARACTERISTIC SUMMARY: There is no change in electrical parametric performance. Characterization data is available upon request. CHANGED PART IDENTIFICATION: There will be no physical change to the Devices assembled with ON Semiconductor Die from Roznov, CR. There will be Wafer Lot traceability from the manufacturing Lot to determine the Die origin. Product assembled with the Die fabricated from the Roznov wafer facility will have a Finish Good Date Code no earlier than ‘1210’. Issue Date: 05-Dec-2011 Rev. 06-Jan-2010 Page 2 of 3 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #16750 List of affected General Parts: 2N7002LT1H NTC3055L104WP NTDV3055L104-1G 2N7002LT3H NTD18N06LT4G NTF2955PT1G 2V7002LT1G NTD18N06T4G NTF2955T1G 2V7002LT3G NTD20N06LT4G NTF3055-100T1G BS170G NTD20N06T4G NTF3055-100T3G BS170RLRAG NTD20P06LG NTF3055L108T1G BSS138LT1G NTD20P06LT4G NTGD1100LT1G BSS138LT3G NTD24N06LT4G NTJD1155LT1G BSS138LT3H NTD24N06T4G NTK3043NT1G BVSS138LT1G NTD2955-1G NTK3043NT1H MMBF170LT1G NTD2955G NTK3043NT5H MMBFV170LT1G NTD2955PT4G NTP2955G MMBFV170LT3G NTD2955T4G NVF2955PT1G NSTA4001NT1G NTD2955T4H NVF2955T1G NSTJD1155LT1G NTD3055-094-1G NVF3055-100T1G NTA4001NT1G NTD3055-094T4G NVF3055L108T1G NTA4001NT1H NTD3055-150T4G NVF3055L108T3G NTA7002NT1G NTD3055-150T4H NVR4003NT3G NTB25P06T4G NTD3055L104-1G NVTA7002NT1G NTB45N06LT4G NTD3055L104G NVTJD4001NT1G NTB45N06T4G NTD3055L104T4G NVTJD4001NT2G NTB5605PT4G NTD3055L170T4G NVTJD4158CT1G NTB60N06T4G NTDV18N06LT4G NVTP2955G NTBV25P06T4G NTDV20N06LT4G SBVS138LT1G NTBV5605T4G NTDV20P06LT4G SMBF1035LT3G NTBV75N06T4G NTDV2955-1G STD20N06T4G NTC18N06LF NTDV2955PT4G STD24N06LT4G Issue Date: 05-Dec-2011 Rev. 06-Jan-2010 Page 3 of 3