ELDRS_50K_Report_RH117K_Fab_Lot_W0944174_1_W7.pdf

ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
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ELDRS Report
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Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Enhanced Low Dose Rate Sensitivity (ELDRS) Radiation Testing of the
RH117K Positive Adjustable Regulator for Linear Technology
Customer: Linear Technology, PO# 7217J
RAD Job Number: 12-979
Part Type Tested: RH117K Positive Adjustable Regulator, Linear Technology RH117 Datasheet
Revision B
Traceability Information: Fab Lot Number: W0944174.1, Assembly Lot Number: 660845.1, Wafer
Number: 7, Date Code: 1210A See photograph of unit under test in Appendix A.
Quantity of Units: 11 units received, 5 units for biased irradiation, 5 units for unbiased irradiation and 1
unit for control. Serial numbers 2, 6, 7, 8 and 10 were biased during irradiation, serial numbers 11, 14,
17, 19 and 20 were unbiased during irradiation and serial number 51 was used as control. See Appendix
B for the radiation bias connection table.
Radiation and Electrical Test Increments: 10mrad(Si)/s ionizing radiation with electrical test
increments: pre-irradiation, 10krad(Si), 20krad(Si), 30krad(Si) and 50krad(Si).
Pre-Irradiation Burn-In: Burn-In performed by Linear Technology prior to receipt by RAD
Overtest and Post-Irradiation Anneal: No overtest. 24-hour room temperature anneal followed by a
168-hour 100°C anneal. Both anneals were performed in the same electrical bias condition as the
irradiations. Electrical measurements were made following each anneal increment.
Radiation Test Standard: MIL-STD-750E TM1019 and/or MIL-STD-883H TM1019 Condition D and
Linear Technology Linear Technology RH117 Datasheet Revision B.
Test Hardware and Software: LTS2020 Automated Tester, Entity ID TS04, Calibration Date:
4/26/2012, Calibration Due: 4/26/2013. LTS2101 Family Board, Entity ID FB02. LTS0606A Test
Fixture, Entity ID TF35. RH117K DUT Board. Test Program: RH117LTK.SRC
Facility and Radiation Source: Aeroflex RAD's Longmire Laboratories, Colorado Springs, CO.
Gamma rays provided by Co60 (GB-150) low dose rate source. Dosimetry performed by Air Ionization
Chamber (AIC) traceable to NIST. Aeroflex RAD's dosimetry has been audited by DSCC and Aeroflex
RAD has been awarded Laboratory Suitability for MIL-STD-750 and MIL-STD-883 TM 1019.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and
MIL-STD-750.
Test Result: PASSED the enhanced low dose rate sensitivity test to the
maximum tested dose level of 50krad(Si) with all parameters remaining within
their datasheet specifications.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
1.0. Overview and Background
It is well known that total dose ionizing radiation can cause parametric degradation and ultimately
functional failure in electronic devices. The damage occurs via electron-hole pair production, transport
and trapping in the dielectric regions. In advanced CMOS technology nodes (0.6µm and smaller) the
bulk of the damage is manifested in the thicker isolation regions, such as shallow trench or local
oxidation of silicon (LOCOS) oxides (also known as "birds-beak" oxides). However, many linear and
mixed signal devices that utilize bipolar minority carrier elements exhibit an enhanced low dose rate
sensitivity (ELDRS). At this time there is no known or accepted a priori method for predicting
susceptibility to ELDRS or simulating the low dose rate sensitivity with a "conventional" room
temperature 50-300rad(Si)/s irradiation (Condition A in MIL-STD-883 TM 1019.8). Over the past 10
years a number of accelerating techniques have been examined, including an elevated temperature
anneal, such as that used for MOS devices (see ASTM-F-1892 for more technical details) and irradiating
at various temperatures. However, none of these techniques have proven useful across the wide variety
of linear and/or mixed signal devices used in spaceborne applications.
The latest requirement incorporated in MIL-STD-883 TM 1019 requires that devices that could
potentially exhibit ELDRS "shall be tested either at the intended application dose rate, at a prescribed
low dose rate to an overtest radiation level, or with an accelerated test such as an elevated temperature
irradiation test that includes a parameter delta design margin". While the recently released MIL-STD883 TM 1019 allows for accelerated testing, the requirements for this are to essentially perform a low
dose rate ELDRS test to verify the suitability of the acceleration method on the component of interest
before the acceleration technique can be instituted. Based on the limitations of accelerated testing and to
meet the requirements of MIL-STD-883 TM1019.8 Condition D, we have performed a low dose rate test
at 10mrad(Si)/s.
2.0. Radiation Test Apparatus
The low dose rate testing described in this final report was performed using the facilities at Aeroflex
RAD's Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s, determined by the distance
from the source. For low dose rate testing described in this report, the devices are placed approximately
2-meters from the Co-60 rods. The irradiator calibration is maintained by Aeroflex RAD's Longmire
Laboratories using air ionization chamber (AIC) dosimetry traceable to the National Institute of
Standards and Technology (NIST). Figure 2.1 shows a photograph of the GB-150 Co-60 irradiator at
Aeroflex RAD's Longmire Laboratory facility.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Figure 2.1. Aeroflex RAD's Co-60 irradiator. The dose rate is obtained by positioning the device-under-test at a
fixed distance from the gamma cell. The dose rate for this irradiator varies from approximately 50rad(Si)/s close
to the rods down to <1mrad(Si)/s at a distance of approximately 4-meters.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
3.0. Radiation Test Conditions
The RH117K Positive Adjustable Regulator described in this final report were irradiated using a split
15V supply and with all pins tied to ground, that is biased and unbiased. See Appendix B for details on
the biasing conditions during radiation exposure. In our opinion, this bias circuit satisfies the
requirements of MIL-STD-883H TM1019.8 Section 3.9.3 Bias and Loading Conditions which states
"The bias applied to the test devices shall be selected to produce the greatest radiation induced damage
or the worst-case damage for the intended application, if known. While maximum voltage is often worst
case some bipolar linear device parameters (e.g. input bias current or maximum output load current)
exhibit more degradation with 0 V bias."
The devices were irradiated to a maximum total ionizing dose level of 50krad(Si) with incremental
readings at 10krad(Si), 20krad(Si) and 30krad(Si). Electrical testing occurred within one hour following
the end of each irradiation segment. For intermediate irradiations, the units were tested and returned to
total dose exposure within two hours from the end of the previous radiation increment. The radiation
exposure bias board was positioned in the Co-60 cell to provide the targeted dose rate of10mrad(Si)/s
and was located inside a lead-aluminum enclosure. The lead-aluminum enclosure is required under MILSTD-883H TM1019.8 Section 3.4 that reads as follows: "Lead/Aluminum (Pb/Al) container. Test
specimens shall be enclosed in a Pb/Al container to minimize dose enhancement effects caused by lowenergy, scattered radiation. A minimum of 1.5 mm Pb, surrounding an inner shield of at least 0.7 mm
Al, is required. This Pb/Al container produces an approximate charged particle equilibrium for Si and
for TLDs such as CaF2. The radiation field intensity shall be measured inside the Pb/Al container (1)
initially, (2) when the source is changed, or (3) when the orientation or configuration of the source,
container, or test-fixture is changed. This measurement shall be performed by placing a dosimeter (e.g.,
a TLD) in the device-irradiation container at the approximate test-device position. If it can be
demonstrated that low energy scattered radiation is small enough that it will not cause dosimetry errors
due to dose enhancement, the Pb/Al container may be omitted".
The final dose rate within the lead-aluminum box was determined based on air ionization chamber
(AIC) dosimetry measurements just prior to the beginning of the total dose irradiations. The final dose
rate for this work was 10mrad(Si)/s with a precision of ±5%.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
4.0. Tested Parameters
During the enhanced low dose rate sensitivity testing the following electrical parameters were measured
pre- and post-irradiation:
1. Reference Voltage 1 (V) @ VDIFF=3V, IL=10mA
2. Reference Voltage 2 (V) @ VDIFF=40V, IL=10mA
3. Reference Voltage 3 (V) @ VDIFF=3V, IL=1.5A
4. Reference Voltage 4 (V) @ VDIFF=40V, IL=0.3A
5. Line Regulation (%/V) @ VDIFF=3V TO 40V, IL=10mA
6. Load Regulation 1 (V) @ VOUT<=5V, IL=10mA TO 1.5A
7. Load Regulation 2 (%) @ VOUT>=5V, IL=10mA TO 1.5A
8. Adjust Pin Current 1 (A) @ VDIFF=2.5V, IL=10mA
9. Adjust Pin Current 2 (A) @ VDIFF=5V, IL=10mA
10. Adjust Pin Current 3 (A) @ VDIFF=40V, IL=10mA
11. Adjust Pin Current Change 1 (A) @ VDIFF=5V, IL=10mA TO 1.5A
12. Adjust Pin Current Change 2 (A) @ VDIFF=2.5V TO 40V, IL=10mA
13. Minimum Load Current (A) @ VDIFF=40V
14. Current Limit 1 (A) @ VIN-VOUT=15V
15. Current Limit 2 (A) @ VIN-VOUT=40V
Appendix C details the measured parameters, test conditions, pre-irradiation specification and
measurement resolution for each of the measurements.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
An ISO 9001:2008 and DSCC Certified Company
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
5.0. ELDRS Test Results
Based on this criterion the RH117K Positive Adjustable Regulator (from the lot traceability information
provided on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the
maximum tested dose level of 50krad(Si) with all parameters remaining within their datasheet
specifications.
Figures 5.1 through 5.15 show plots of all the measured parameters versus total ionizing dose while
Tables 5.1 - 5.15 show the corresponding raw data for each of these parameters. In the data plots the
solid diamonds are the average of the measured data points for the sample irradiated under electrical bias
while the shaded diamonds are the average of the measured data points for the units irradiated with all
pins tied to ground. The black lines (solid or dashed) are the average of the data points after application
of the KTL statistics on the sample irradiated in the biased condition while the shaded lines (solid or
dashed) are the average of the data points after application of the KTL statistics on the sample irradiated
in the unbiased condition. The red dotted line(s) are the pre- and/or post-irradiation minimum and/or
maximum specification value as defined in the datasheet and/or test plan.
In addition to the radiation test results, the data plots and tables described above contain anneal data.
The anneals are performed to better understand the underlying physical mechanisms responsible for
radiation-induced parametric shifts and are not part of the criteria used to establish whether or not the lot
passes or fails the low dose rate test. In all cases the parts either improved or exhibited no change during
the anneal.
The control units, as expected, show no significant changes to any of the parameters. Therefore we can
conclude that the electrical testing remained in control throughout the duration of the tests and the
observed degradation was due to the radiation exposure. Appendix D lists the figures used in this section
to facilitate the location of a particular parameter.
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Reference Voltage 1 (V) @ VDIFF=3V, IL=10mA
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.32E+00
1.30E+00
1.28E+00
1.26E+00
1.24E+00
1.22E+00
1.20E+00
1.18E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.1. Plot of Reference Voltage 1 (V) @ VDIFF=3V, IL=10mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.1. Raw data for Reference Voltage 1 (V) @ VDIFF=3V, IL=10mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 1 (V)
@ VDIFF=3V, IL=10mA
Device
2
6
7
8
10
11
14
17
19
20
51
0
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Biased Statistics
Average Biased
1.24E+00
Std Dev Biased
3.78E-03
Ps90%/90% (+KTL) Biased
1.25E+00
Ps90%/90% (-KTL) Biased
1.23E+00
Un-Biased Statistics
Average Un-Biased
1.25E+00
Std Dev Un-Biased
3.27E-03
Ps90%/90% (+KTL) Un-Biased 1.26E+00
Ps90%/90% (-KTL) Un-Biased
1.24E+00
Specification MIN
1.20E+00
Status
PASS
Specification MAX
1.30E+00
Status
PASS
Total
10
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Dose (krad(Si))
20
30
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
50
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
24-hr
Anneal
60
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
168-hr
Anneal
70
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00
3.65E-03 3.35E-03 3.35E-03 3.35E-03 3.32E-03 3.83E-03
1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00
1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00
1.25E+00
3.42E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.90E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.90E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.24E+00
4.21E-03
1.25E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
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1.24E+00
4.39E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.91E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
Reference Voltage 2 (V) @ VDIFF=40V, IL=10mA
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.32E+00
1.30E+00
1.28E+00
1.26E+00
1.24E+00
1.22E+00
1.20E+00
1.18E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.2. Plot of Reference Voltage 2 (V) @ VDIFF=40V, IL=10mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
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ELDRS Report
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Aeroflex RAD
5017 N. 30th Street
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(719) 531-0800
Table 5.2. Raw data for Reference Voltage 2 (V) @ VDIFF=40V, IL=10mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 2 (V)
@ VDIFF=40V, IL=10mA
Device
2
6
7
8
10
11
14
17
19
20
51
0
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Biased Statistics
Average Biased
1.25E+00
Std Dev Biased
3.90E-03
Ps90%/90% (+KTL) Biased
1.26E+00
Ps90%/90% (-KTL) Biased
1.23E+00
Un-Biased Statistics
Average Un-Biased
1.25E+00
Std Dev Un-Biased
3.21E-03
Ps90%/90% (+KTL) Un-Biased 1.26E+00
Ps90%/90% (-KTL) Un-Biased
1.24E+00
Specification MIN
1.20E+00
Status
PASS
Specification MAX
1.30E+00
Status
PASS
Total
10
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Dose (krad(Si))
20
30
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.24E+00 1.24E+00
1.25E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
50
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
24-hr
Anneal
60
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
168-hr
Anneal
70
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00
3.70E-03 3.58E-03 3.58E-03 3.29E-03 3.35E-03 3.35E-03
1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00
1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00
1.25E+00
3.70E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.42E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
4.09E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.24E+00
4.36E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
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1.24E+00
4.21E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.90E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
Reference Voltage 3 (V) @ VDIFF=3V, IL=1.5A
ELDRS Report
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Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.32E+00
1.30E+00
1.28E+00
1.26E+00
1.24E+00
1.22E+00
1.20E+00
1.18E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.3. Plot of Reference Voltage 3 (V) @ VDIFF=3V, IL=1.5A versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
12
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.3. Raw data for Reference Voltage 3 (V) @ VDIFF=3V, IL=1.5A versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 3 (V)
@ VDIFF=3V, IL=1.5A
Device
2
6
7
8
10
11
14
17
19
20
51
0
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Biased Statistics
Average Biased
1.24E+00
Std Dev Biased
3.63E-03
Ps90%/90% (+KTL) Biased
1.25E+00
Ps90%/90% (-KTL) Biased
1.23E+00
Un-Biased Statistics
Average Un-Biased
1.25E+00
Std Dev Un-Biased
3.70E-03
Ps90%/90% (+KTL) Un-Biased 1.26E+00
Ps90%/90% (-KTL) Un-Biased
1.24E+00
Specification MIN
1.20E+00
Status
PASS
Specification MAX
1.30E+00
Status
PASS
Total
10
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
Dose (krad(Si))
20
30
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.24E+00
1.25E+00 1.25E+00
50
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
24-hr
Anneal
60
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
168-hr
Anneal
70
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00
3.83E-03 3.35E-03 3.35E-03 3.11E-03 3.11E-03 3.35E-03
1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00
1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00
1.25E+00
3.78E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.67E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.24E+00
4.09E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.24E+00
4.66E-03
1.25E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
13
1.24E+00
4.66E-03
1.25E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.24E+00
3.91E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
Reference Voltage 4 (V) @ VDIFF=40V, IL=0.3A
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
1.32E+00
1.30E+00
1.28E+00
1.26E+00
1.24E+00
1.22E+00
1.20E+00
1.18E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.4. Plot of Reference Voltage 4 (V) @ VDIFF=40V, IL=0.3A versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
14
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.4. Raw data for Reference Voltage 4 (V) @ VDIFF=40V, IL=0.3A versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Reference Voltage 4 (V)
@ VDIFF=40V, IL=0.3A
Device
2
6
7
8
10
11
14
17
19
20
51
0
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Biased Statistics
Average Biased
1.25E+00
Std Dev Biased
3.90E-03
Ps90%/90% (+KTL) Biased
1.26E+00
Ps90%/90% (-KTL) Biased
1.23E+00
Un-Biased Statistics
Average Un-Biased
1.25E+00
Std Dev Un-Biased
3.58E-03
Ps90%/90% (+KTL) Un-Biased 1.26E+00
Ps90%/90% (-KTL) Un-Biased
1.24E+00
Specification MIN
1.20E+00
Status
PASS
Specification MAX
1.30E+00
Status
PASS
Total
10
1.24E+00
1.24E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
Dose (krad(Si))
20
30
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
1.24E+00 1.24E+00
1.24E+00 1.24E+00
1.25E+00 1.25E+00
1.25E+00 1.25E+00
50
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
24-hr
Anneal
60
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
168-hr
Anneal
70
1.24E+00
1.24E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.25E+00
1.24E+00
1.24E+00
1.25E+00
1.25E+00
1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00 1.24E+00
3.58E-03 3.65E-03 3.78E-03 3.29E-03 3.11E-03 3.35E-03
1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00 1.25E+00
1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00 1.23E+00
1.25E+00
3.91E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.58E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
4.09E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.24E+00
4.09E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
15
1.24E+00
4.36E-03
1.26E+00
1.23E+00
1.20E+00
PASS
1.30E+00
PASS
1.25E+00
3.67E-03
1.26E+00
1.24E+00
1.20E+00
PASS
1.30E+00
PASS
Line Regulation (%/V) @ VDIFF=3V TO 40V, IL=10mA
ELDRS Report
12-979 130327 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
2.50E-02
2.00E-02
1.50E-02
1.00E-02
5.00E-03
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.5. Plot of Line Regulation (%/V) @ VDIFF=3V TO 40V, IL=10mA versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
16
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.5. Raw data for Line Regulation (%/V) @ VDIFF=3V TO 40V, IL=10mA versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Line Regulation (%/V)
Total Dose (krad(Si))
Anneal
Anneal
@ VDIFF=3V TO 40V, IL=10mA
Device
0
10
20
30
50
60
70
2 1.40E-03 1.20E-03 1.30E-03 1.40E-03 1.20E-03 1.20E-03 1.30E-03
6 1.40E-03 1.30E-03 1.50E-03 1.50E-03 1.60E-03 1.50E-03 1.40E-03
7 1.60E-03 1.50E-03 1.70E-03 1.70E-03 1.80E-03 1.90E-03 1.60E-03
8 1.30E-03 1.30E-03 1.40E-03 1.50E-03 1.50E-03 1.50E-03 1.40E-03
10 1.40E-03 1.30E-03 1.40E-03 1.40E-03 1.50E-03 1.70E-03 1.30E-03
11 1.30E-03 1.40E-03 1.40E-03 1.50E-03 1.40E-03 1.40E-03 1.30E-03
14 1.30E-03 1.30E-03 1.50E-03 1.50E-03 1.60E-03 1.60E-03 1.50E-03
17 1.30E-03 1.40E-03 1.40E-03 1.50E-03 1.60E-03 1.60E-03 1.50E-03
19 1.50E-03 1.60E-03 1.50E-03 1.70E-03 2.00E-03 1.90E-03 1.70E-03
20 1.40E-03 1.50E-03 1.50E-03 1.70E-03 1.90E-03 1.90E-03 1.50E-03
51 1.40E-03 1.50E-03 1.50E-03 1.30E-03 1.50E-03 1.30E-03 1.40E-03
Biased Statistics
Average Biased
1.42E-03 1.32E-03 1.46E-03 1.50E-03 1.52E-03 1.56E-03 1.40E-03
Std Dev Biased
1.10E-04 1.10E-04 1.52E-04 1.22E-04 2.17E-04 2.61E-04 1.22E-04
Ps90%/90% (+KTL) Biased
1.72E-03 1.62E-03 1.88E-03 1.84E-03 2.11E-03 2.28E-03 1.74E-03
Ps90%/90% (-KTL) Biased
1.12E-03 1.02E-03 1.04E-03 1.16E-03 9.26E-04 8.45E-04 1.06E-03
Un-Biased Statistics
Average Un-Biased
1.36E-03 1.44E-03 1.46E-03 1.58E-03 1.70E-03 1.68E-03 1.50E-03
Std Dev Un-Biased
8.94E-05 1.14E-04 5.48E-05 1.10E-04 2.45E-04 2.17E-04 1.41E-04
Ps90%/90% (+KTL) Un-Biased
1.61E-03 1.75E-03 1.61E-03 1.88E-03 2.37E-03 2.27E-03 1.89E-03
Ps90%/90% (-KTL) Un-Biased
1.11E-03 1.13E-03 1.31E-03 1.28E-03 1.03E-03 1.09E-03 1.11E-03
Specification MAX
2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02 2.00E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
17
ELDRS Report
12-979 130327 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
Load Regulation 1 (V)
@ VOUT<=5V, IL=10mA TO 1.5A
6.00E-02
5.00E-02
4.00E-02
3.00E-02
2.00E-02
1.00E-02
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.6. Plot of Load Regulation 1 (V) @ VOUT<=5V, IL=10mA TO 1.5A versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
18
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.6. Raw data for Load Regulation 1 (V) @ VOUT<=5V, IL=10mA TO 1.5A versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
24-hr
168-hr
Load Regulation 1 (V)
Anneal
Anneal
Total Dose (krad(Si))
@ VOUT<=5V, IL=10mA TO 1.5A
Device
0
10
20
30
50
60
70
2 4.45E-04 8.30E-04 7.58E-04 8.84E-04 1.23E-03 1.04E-03 9.08E-04
6 6.69E-04 6.49E-04 9.04E-04 1.06E-03 1.16E-03 1.41E-03 1.27E-03
7 4.65E-04 6.01E-04 9.23E-04 1.26E-03 1.49E-03 1.47E-03 1.19E-03
8 6.35E-04 9.01E-04 5.71E-04 8.56E-04 1.02E-03 1.22E-03 7.31E-04
10 6.43E-04 9.60E-04 9.92E-04 1.23E-03 1.45E-03 1.27E-03 1.01E-03
11 7.53E-04 8.84E-04 6.82E-04 7.24E-04 9.95E-04 9.89E-04 1.08E-03
14 3.69E-04 6.57E-04 9.06E-04 9.43E-04 1.11E-03 1.45E-03 1.20E-03
17 7.06E-04 8.03E-04 6.25E-04 1.13E-03 1.09E-03 1.62E-03 1.16E-03
19 6.57E-04 7.51E-04 1.03E-03 1.16E-03 1.62E-03 1.70E-03 1.36E-03
20 6.23E-04 7.92E-04 8.84E-04 1.23E-03 1.44E-03 1.38E-03 1.29E-03
51 4.33E-04 8.07E-04 5.59E-04 5.74E-04 8.64E-04 6.40E-04 5.39E-04
Biased Statistics
Average Biased
5.71E-04 7.88E-04 8.30E-04 1.06E-03 1.27E-03 1.28E-03 1.02E-03
Std Dev Biased
1.07E-04 1.57E-04 1.68E-04 1.88E-04 1.98E-04 1.68E-04 2.15E-04
Ps90%/90% (+KTL) Biased
8.65E-04 1.22E-03 1.29E-03 1.57E-03 1.81E-03 1.74E-03 1.61E-03
Ps90%/90% (-KTL) Biased
2.77E-04 3.58E-04 3.69E-04 5.43E-04 7.28E-04 8.22E-04 4.30E-04
Un-Biased Statistics
Average Un-Biased
6.22E-04 7.77E-04 8.26E-04 1.04E-03 1.25E-03 1.43E-03 1.22E-03
Std Dev Un-Biased
1.50E-04 8.28E-05 1.69E-04 2.03E-04 2.67E-04 2.76E-04 1.08E-04
Ps90%/90% (+KTL) Un-Biased
1.03E-03 1.00E-03 1.29E-03 1.59E-03 1.98E-03 2.18E-03 1.51E-03
Ps90%/90% (-KTL) Un-Biased
2.12E-04 5.50E-04 3.63E-04 4.79E-04 5.18E-04 6.69E-04 9.23E-04
Specification MAX
1.50E-02 3.60E-02 4.20E-02 4.20E-02 4.80E-02 4.80E-02 4.80E-02
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
19
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Load Regulation 2 (%)
@ VOUT>=5V, IL=10mA TO 1.5A
1.50E+00
1.00E+00
5.00E-01
0.00E+00
-5.00E-01
-1.00E+00
-1.50E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.7. Plot of Load Regulation 2 (%) @ VOUT>=5V, IL=10mA TO 1.5A versus total dose. The solid
diamonds are the average of the measured data points for the samples irradiated under electrical bias while the
shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
20
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.7. Raw data for Load Regulation 2 (%) @ VOUT>=5V, IL=10mA TO 1.5A versus total dose, including
the statistical analysis, specification and the status of the testing (pass/fail).
Load Regulation 2 (%)
@ VOUT>=5V, IL=10mA TO 1.5A
Device
2
6
7
8
10
11
14
17
19
20
51
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
-1.53E-01
-1.49E-01
-1.41E-01
-1.42E-01
-1.53E-01
-1.52E-01
-1.48E-01
-1.47E-01
-1.43E-01
-1.45E-01
-1.66E-01
Total
10
-1.49E-01
-1.57E-01
-1.48E-01
-1.46E-01
-1.58E-01
-1.47E-01
-1.58E-01
-1.54E-01
-1.56E-01
-1.52E-01
-1.63E-01
Dose (krad(Si))
20
30
-1.64E-01 -1.64E-01
-1.67E-01 -1.63E-01
-1.50E-01 -1.75E-01
-1.65E-01 -1.72E-01
-1.54E-01 -1.79E-01
-1.52E-01 -1.71E-01
-1.53E-01 -1.79E-01
-1.62E-01 -1.64E-01
-1.56E-01 -1.54E-01
-1.48E-01 -1.79E-01
-1.52E-01 -1.42E-01
50
-1.75E-01
-2.18E-01
-1.82E-01
-1.82E-01
-1.71E-01
-1.54E-01
-1.71E-01
-1.82E-01
-1.72E-01
-1.69E-01
-1.63E-01
24-hr
Anneal
60
-1.62E-01
-1.75E-01
-1.72E-01
-1.69E-01
-1.73E-01
-1.62E-01
-1.60E-01
-1.68E-01
-1.69E-01
-1.65E-01
-1.69E-01
168-hr
Anneal
70
-1.68E-01
-1.72E-01
-1.63E-01
-1.56E-01
-1.62E-01
-1.61E-01
-1.62E-01
-1.68E-01
-1.78E-01
-1.69E-01
-1.54E-01
-1.48E-01 -1.52E-01 -1.60E-01 -1.71E-01 -1.86E-01 -1.70E-01 -1.64E-01
5.81E-03 5.50E-03 7.52E-03 6.95E-03 1.87E-02 5.07E-03 6.10E-03
-1.32E-01 -1.37E-01 -1.39E-01 -1.52E-01 -1.34E-01 -1.56E-01 -1.47E-01
-1.64E-01 -1.67E-01 -1.81E-01 -1.90E-01 -2.37E-01 -1.84E-01 -1.81E-01
-1.47E-01
3.39E-03
-1.38E-01
-1.56E-01
-3.00E-01
PASS
3.00E-01
PASS
-1.53E-01
4.22E-03
-1.42E-01
-1.65E-01
-7.20E-01
PASS
7.20E-01
PASS
-1.54E-01
5.22E-03
-1.40E-01
-1.69E-01
-8.40E-01
PASS
8.40E-01
PASS
-1.69E-01
1.06E-02
-1.40E-01
-1.99E-01
-8.40E-01
PASS
8.40E-01
PASS
-1.70E-01
1.01E-02
-1.42E-01
-1.97E-01
-9.60E-01
PASS
9.60E-01
PASS
An ISO 9001:2008 and DSCC Certified Company
21
-1.65E-01
3.83E-03
-1.54E-01
-1.75E-01
-9.60E-01
PASS
9.60E-01
PASS
-1.68E-01
6.80E-03
-1.49E-01
-1.86E-01
-9.60E-01
PASS
9.60E-01
PASS
Adjust Pin Current 1 (A) @ VDIFF=2.5V, IL=10mA
ELDRS Report
12-979 130327 R1.0
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Ps90%/90% (+KTL) Biased
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.8. Plot of Adjust Pin Current 1 (A) @ VDIFF=2.5V, IL=10mA versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
22
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.8. Raw data for Adjust Pin Current 1 (A) @ VDIFF=2.5V, IL=10mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Adjust Pin Current 1 (A)
@ VDIFF=2.5V, IL=10mA
Device
2
6
7
8
10
11
14
17
19
20
51
0
3.68E-05
3.74E-05
3.80E-05
3.74E-05
3.68E-05
3.74E-05
3.74E-05
3.74E-05
3.85E-05
3.68E-05
3.68E-05
Total
10
3.74E-05
3.80E-05
3.80E-05
3.80E-05
3.72E-05
3.74E-05
3.74E-05
3.72E-05
3.82E-05
3.68E-05
3.68E-05
Dose (krad(Si))
20
30
3.69E-05 3.72E-05
3.75E-05 3.74E-05
3.81E-05 3.80E-05
3.77E-05 3.80E-05
3.69E-05 3.68E-05
3.75E-05 3.74E-05
3.75E-05 3.74E-05
3.70E-05 3.68E-05
3.81E-05 3.80E-05
3.69E-05 3.68E-05
3.69E-05 3.68E-05
50
3.72E-05
3.74E-05
3.79E-05
3.79E-05
3.68E-05
3.75E-05
3.74E-05
3.68E-05
3.80E-05
3.68E-05
3.68E-05
24-hr
Anneal
60
3.74E-05
3.79E-05
3.80E-05
3.80E-05
3.69E-05
3.75E-05
3.74E-05
3.69E-05
3.80E-05
3.68E-05
3.68E-05
168-hr
Anneal
70
3.68E-05
3.74E-05
3.75E-05
3.74E-05
3.68E-05
3.74E-05
3.74E-05
3.71E-05
3.80E-05
3.68E-05
3.68E-05
Biased Statistics
Average Biased
3.73E-05 3.77E-05 3.74E-05 3.75E-05 3.74E-05 3.76E-05 3.72E-05
Std Dev Biased
5.10E-07 3.80E-07 5.23E-07 5.36E-07 4.78E-07 5.04E-07 3.64E-07
Ps90%/90% (+KTL) Biased
3.87E-05 3.88E-05 3.88E-05 3.89E-05 3.88E-05 3.90E-05 3.82E-05
Ps90%/90% (-KTL) Biased
3.59E-05 3.67E-05 3.59E-05 3.60E-05 3.61E-05 3.62E-05 3.62E-05
Un-Biased Statistics
Average Un-Biased
3.75E-05 3.74E-05 3.74E-05 3.73E-05 3.73E-05 3.73E-05 3.73E-05
Std Dev Un-Biased
6.38E-07 5.06E-07 5.06E-07 5.11E-07 5.24E-07 5.03E-07 4.70E-07
Ps90%/90% (+KTL) Un-Biased
3.92E-05 3.88E-05 3.88E-05 3.87E-05 3.87E-05 3.87E-05 3.86E-05
Ps90%/90% (-KTL) Un-Biased
3.57E-05 3.60E-05 3.60E-05 3.59E-05 3.59E-05 3.59E-05 3.60E-05
Specification MAX
1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
23
Adjust Pin Current 2 (A) @ VDIFF=5V, IL=10mA
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168hr
70
Anneal
Total Dose (krad(Si))
Figure 5.9. Plot of Adjust Pin Current 2 (A) @ VDIFF=5V, IL=10mA versus total dose. The solid diamonds are
the average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds
are the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
24
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.9. Raw data for Adjust Pin Current 2 (A) @ VDIFF=5V, IL=10mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Adjust Pin Current 2 (A)
@ VDIFF=5V, IL=10mA
Device
2
6
7
8
10
11
14
17
19
20
51
0
3.68E-05
3.74E-05
3.80E-05
3.74E-05
3.68E-05
3.74E-05
3.74E-05
3.73E-05
3.86E-05
3.68E-05
3.68E-05
Total
10
3.74E-05
3.79E-05
3.80E-05
3.80E-05
3.72E-05
3.74E-05
3.74E-05
3.71E-05
3.81E-05
3.68E-05
3.68E-05
Dose (krad(Si))
20
30
3.69E-05 3.71E-05
3.75E-05 3.75E-05
3.81E-05 3.80E-05
3.75E-05 3.80E-05
3.69E-05 3.68E-05
3.75E-05 3.74E-05
3.75E-05 3.74E-05
3.70E-05 3.68E-05
3.81E-05 3.80E-05
3.69E-05 3.68E-05
3.69E-05 3.68E-05
50
3.71E-05
3.74E-05
3.79E-05
3.78E-05
3.68E-05
3.75E-05
3.74E-05
3.68E-05
3.80E-05
3.67E-05
3.69E-05
24-hr
Anneal
60
3.74E-05
3.79E-05
3.80E-05
3.80E-05
3.69E-05
3.74E-05
3.74E-05
3.69E-05
3.80E-05
3.68E-05
3.68E-05
168-hr
Anneal
70
3.68E-05
3.74E-05
3.75E-05
3.74E-05
3.68E-05
3.74E-05
3.74E-05
3.70E-05
3.81E-05
3.68E-05
3.68E-05
Biased Statistics
Average Biased
3.73E-05 3.77E-05 3.74E-05 3.75E-05 3.74E-05 3.76E-05 3.72E-05
Std Dev Biased
5.10E-07 3.87E-07 5.07E-07 5.39E-07 4.78E-07 5.02E-07 3.64E-07
Ps90%/90% (+KTL) Biased
3.87E-05 3.88E-05 3.88E-05 3.90E-05 3.87E-05 3.90E-05 3.82E-05
Ps90%/90% (-KTL) Biased
3.59E-05 3.66E-05 3.60E-05 3.60E-05 3.61E-05 3.63E-05 3.62E-05
Un-Biased Statistics
Average Un-Biased
3.75E-05 3.74E-05 3.74E-05 3.73E-05 3.73E-05 3.73E-05 3.73E-05
Std Dev Un-Biased
6.43E-07 4.96E-07 4.91E-07 5.11E-07 5.26E-07 4.92E-07 4.82E-07
Ps90%/90% (+KTL) Un-Biased
3.93E-05 3.87E-05 3.87E-05 3.87E-05 3.87E-05 3.87E-05 3.87E-05
Ps90%/90% (-KTL) Un-Biased
3.57E-05 3.60E-05 3.60E-05 3.59E-05 3.58E-05 3.60E-05 3.60E-05
Specification MAX
1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
25
Adjust Pin Current 3 (A) @ VDIFF=40V, IL=10mA
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
1.20E-04
1.00E-04
8.00E-05
6.00E-05
4.00E-05
2.00E-05
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.10. Plot of Adjust Pin Current 3 (A) @ VDIFF=40V, IL=10mA versus total dose. The solid diamonds
are the average of the measured data points for the samples irradiated under electrical bias while the shaded
diamonds are the average of the measured data points for the samples irradiated with all pins tied to ground. The
black lines (solid and/or dashed) are the average of the data points after application of the KTL statistics on the
samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data
points after application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted
line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in the
datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
26
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.10. Raw data for Adjust Pin Current 3 (A) @ VDIFF=40V, IL=10mA versus total dose, including the
statistical analysis, specification and the status of the testing (pass/fail).
Adjust Pin Current 3 (A)
@ VDIFF=40V, IL=10mA
Device
2
6
7
8
10
11
14
17
19
20
51
0
3.68E-05
3.74E-05
3.80E-05
3.74E-05
3.68E-05
3.76E-05
3.74E-05
3.74E-05
3.86E-05
3.68E-05
3.68E-05
Total
10
3.74E-05
3.80E-05
3.80E-05
3.80E-05
3.73E-05
3.76E-05
3.74E-05
3.73E-05
3.85E-05
3.68E-05
3.69E-05
Dose (krad(Si))
20
30
3.71E-05 3.73E-05
3.75E-05 3.77E-05
3.81E-05 3.80E-05
3.79E-05 3.80E-05
3.69E-05 3.68E-05
3.75E-05 3.74E-05
3.75E-05 3.74E-05
3.73E-05 3.71E-05
3.83E-05 3.80E-05
3.69E-05 3.68E-05
3.69E-05 3.68E-05
50
3.74E-05
3.74E-05
3.80E-05
3.80E-05
3.68E-05
3.76E-05
3.74E-05
3.69E-05
3.80E-05
3.68E-05
3.70E-05
24-hr
Anneal
60
3.74E-05
3.80E-05
3.80E-05
3.80E-05
3.70E-05
3.76E-05
3.74E-05
3.72E-05
3.81E-05
3.68E-05
3.70E-05
168-hr
Anneal
70
3.68E-05
3.74E-05
3.79E-05
3.74E-05
3.68E-05
3.74E-05
3.74E-05
3.73E-05
3.83E-05
3.68E-05
3.70E-05
Biased Statistics
Average Biased
3.73E-05 3.78E-05 3.75E-05 3.76E-05 3.75E-05 3.77E-05 3.73E-05
Std Dev Biased
5.12E-07 3.52E-07 5.10E-07 5.19E-07 5.11E-07 4.55E-07 4.82E-07
Ps90%/90% (+KTL) Biased
3.87E-05 3.87E-05 3.89E-05 3.90E-05 3.89E-05 3.89E-05 3.86E-05
Ps90%/90% (-KTL) Biased
3.59E-05 3.68E-05 3.61E-05 3.61E-05 3.61E-05 3.64E-05 3.59E-05
Un-Biased Statistics
Average Un-Biased
3.76E-05 3.75E-05 3.75E-05 3.73E-05 3.73E-05 3.74E-05 3.74E-05
Std Dev Un-Biased
6.65E-07 6.21E-07 5.40E-07 4.56E-07 5.22E-07 4.66E-07 5.34E-07
Ps90%/90% (+KTL) Un-Biased
3.94E-05 3.92E-05 3.90E-05 3.86E-05 3.88E-05 3.87E-05 3.89E-05
Ps90%/90% (-KTL) Un-Biased
3.57E-05 3.58E-05 3.60E-05 3.61E-05 3.59E-05 3.61E-05 3.60E-05
Specification MAX
1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04 1.00E-04
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
27
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Adjust Pin Current Change 1 (A)
@ VDIFF=5V, IL=10mA TO 1.5A
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.11. Plot of Adjust Pin Current Change 1 (A) @ VDIFF=5V, IL=10mA TO 1.5A versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
28
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.11. Raw data for Adjust Pin Current Change 1 (A) @ VDIFF=5V, IL=10mA TO 1.5A versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Adjust Pin Current Change 1 (A)
@ VDIFF=5V, IL=10mA TO 1.5A
Device
2
6
7
8
10
11
14
17
19
20
51
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
0.00E+00
0.00E+00
1.20E-08
0.00E+00
2.40E-08
0.00E+00
-4.90E-08
-4.90E-08
0.00E+00
0.00E+00
Total
10
0.00E+00
-8.60E-08
0.00E+00
0.00E+00
4.40E-07
2.40E-08
0.00E+00
3.06E-07
1.47E-07
0.00E+00
0.00E+00
Dose (krad(Si))
20
30
4.90E-08 4.40E-07
0.00E+00 3.70E-08
5.74E-07 0.00E+00
1.47E-07 0.00E+00
0.00E+00 0.00E+00
0.00E+00 0.00E+00
0.00E+00 -1.20E-08
1.71E-07 4.90E-08
3.70E-08 0.00E+00
0.00E+00 -2.40E-08
0.00E+00 0.00E+00
50
3.67E-07
0.00E+00
-6.10E-08
4.28E-07
0.00E+00
7.30E-08
0.00E+00
2.40E-08
0.00E+00
5.74E-07
6.10E-08
24-hr
Anneal
60
0.00E+00
-1.22E-07
0.00E+00
0.00E+00
3.70E-08
6.10E-08
0.00E+00
6.10E-08
0.00E+00
-1.20E-08
4.90E-08
168-hr
Anneal
70
0.00E+00
0.00E+00
1.83E-07
0.00E+00
0.00E+00
0.00E+00
0.00E+00
2.32E-07
7.30E-08
0.00E+00
3.70E-08
2.40E-09 7.08E-08 1.54E-07 9.54E-08 1.47E-07 -1.70E-08 3.66E-08
5.37E-09 2.10E-07 2.42E-07 1.93E-07 2.31E-07 6.08E-08 8.18E-08
1.71E-08 6.46E-07 8.18E-07 6.25E-07 7.81E-07 1.50E-07 2.61E-07
-1.23E-08 -5.04E-07 -5.10E-07 -4.35E-07 -4.87E-07 -1.84E-07 -1.88E-07
-1.48E-08
3.27E-08
7.49E-08
-1.05E-07
-5.00E-06
PASS
5.00E-06
PASS
9.54E-08
1.33E-07
4.59E-07
-2.68E-07
-5.00E-06
PASS
5.00E-06
PASS
4.16E-08
7.41E-08
2.45E-07
-1.62E-07
-5.00E-06
PASS
5.00E-06
PASS
2.60E-09
2.78E-08
7.88E-08
-7.36E-08
-5.00E-06
PASS
5.00E-06
PASS
1.34E-07
2.48E-07
8.13E-07
-5.45E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
29
2.20E-08
3.59E-08
1.21E-07
-7.65E-08
-5.00E-06
PASS
5.00E-06
PASS
6.10E-08
1.01E-07
3.37E-07
-2.15E-07
-5.00E-06
PASS
5.00E-06
PASS
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Biased
Ps90%/90% (-KTL) Un-Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (+KTL) Un-Biased
Specification MIN
Specification MAX
Adjust Pin Current Change 2 (A)
@ VDIFF=2.5V TO 40V, IL=10mA
6.00E-06
4.00E-06
2.00E-06
0.00E+00
-2.00E-06
-4.00E-06
-6.00E-06
0
10
20
30
40
Total Dose (krad(Si))
50
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.12. Plot of Adjust Pin Current Change 2 (A) @ VDIFF=2.5V TO 40V, IL=10mA versus total dose. The
solid diamonds are the average of the measured data points for the samples irradiated under electrical bias while
the shaded diamonds are the average of the measured data points for the samples irradiated with all pins tied to
ground. The black lines (solid and/or dashed) are the average of the data points after application of the KTL
statistics on the samples irradiated under electrical bias while the gray lines (solid and/or dashed) are the average
of the data points after application of the KTL statistics on the samples irradiated in the unbiased condition. The
red dotted line(s) are the pre- and/or post-irradiation minimum and/or maximum specification value as defined in
the datasheet and/or test plan.
An ISO 9001:2008 and DSCC Certified Company
30
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.12. Raw data for Adjust Pin Current Change 2 (A) @ VDIFF=2.5V TO 40V, IL=10mA versus total dose,
including the statistical analysis, specification and the status of the testing (pass/fail).
Adjust Pin Current Change 2 (A)
@ VDIFF=2.5V TO 40V, IL=10mA
Device
2
6
7
8
10
11
14
17
19
20
51
Biased Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Un-Biased Statistics
Average Un-Biased
Std Dev Un-Biased
Ps90%/90% (+KTL) Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Status
Specification MAX
Status
0
0.00E+00
0.00E+00
-1.20E-08
-9.80E-08
0.00E+00
-1.47E-07
0.00E+00
-1.20E-08
-4.90E-08
0.00E+00
0.00E+00
Total
10
0.00E+00
-1.10E-07
-2.40E-08
0.00E+00
-2.32E-07
-2.08E-07
0.00E+00
-2.08E-07
-2.69E-07
0.00E+00
-2.40E-08
Dose (krad(Si))
20
30
-1.59E-07 -2.69E-07
0.00E+00 -1.34E-07
-2.40E-08 0.00E+00
-3.42E-07 0.00E+00
0.00E+00 -2.40E-08
-2.40E-08 0.00E+00
-1.20E-08 -4.90E-08
-3.67E-07 -3.30E-07
-1.96E-07 -2.40E-08
0.00E+00 -1.20E-08
-2.40E-08 -1.20E-08
50
-2.81E-07
0.00E+00
-6.10E-08
-6.10E-08
0.00E+00
-2.69E-07
-2.40E-08
-6.10E-08
0.00E+00
-6.10E-08
-3.06E-07
24-hr
Anneal
60
-1.20E-08
-1.22E-07
0.00E+00
0.00E+00
-8.60E-08
-2.32E-07
0.00E+00
-2.93E-07
-2.40E-08
-2.40E-08
-1.71E-07
168-hr
Anneal
70
0.00E+00
0.00E+00
-2.81E-07
-2.40E-08
0.00E+00
-1.20E-08
0.00E+00
-1.96E-07
-3.42E-07
0.00E+00
-1.59E-07
-2.20E-08 -7.32E-08 -1.05E-07 -8.54E-08 -8.06E-08 -4.40E-08 -6.10E-08
4.28E-08 9.96E-08 1.48E-07 1.17E-07 1.16E-07 5.64E-08 1.23E-07
9.54E-08 2.00E-07 3.01E-07 2.34E-07 2.38E-07 1.11E-07 2.77E-07
-1.39E-07 -3.46E-07 -5.11E-07 -4.05E-07 -3.99E-07 -1.99E-07 -3.99E-07
-4.16E-08
6.23E-08
1.29E-07
-2.12E-07
-5.00E-06
PASS
5.00E-06
PASS
-1.37E-07
1.28E-07
2.13E-07
-4.87E-07
-5.00E-06
PASS
5.00E-06
PASS
-1.20E-07
1.60E-07
3.18E-07
-5.58E-07
-5.00E-06
PASS
5.00E-06
PASS
-8.30E-08
1.39E-07
2.99E-07
-4.65E-07
-5.00E-06
PASS
5.00E-06
PASS
-8.30E-08
1.07E-07
2.11E-07
-3.77E-07
-5.00E-06
PASS
5.00E-06
PASS
An ISO 9001:2008 and DSCC Certified Company
31
-1.15E-07
1.37E-07
2.61E-07
-4.90E-07
-5.00E-06
PASS
5.00E-06
PASS
-1.10E-07
1.54E-07
3.13E-07
-5.33E-07
-5.00E-06
PASS
5.00E-06
PASS
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (+KTL) Un-Biased
Specification MAX
Ps90%/90% (+KTL) Biased
Minimum Load Current (A) @ VDIFF=40V
6.00E-03
5.00E-03
4.00E-03
3.00E-03
2.00E-03
1.00E-03
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.13. Plot of Minimum Load Current (A) @ VDIFF=40V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
32
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.13. Raw data for Minimum Load Current (A) @ VDIFF=40V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Minimum Load Current (A)
@ VDIFF=40V
Device
2
6
7
8
10
11
14
17
19
20
51
0
1.77E-03
1.84E-03
1.88E-03
1.83E-03
1.77E-03
1.81E-03
1.79E-03
1.77E-03
1.98E-03
1.81E-03
1.79E-03
Total
10
1.73E-03
1.81E-03
1.86E-03
1.79E-03
1.75E-03
1.81E-03
1.79E-03
1.79E-03
2.00E-03
1.81E-03
1.79E-03
Dose (krad(Si))
20
30
1.75E-03 1.75E-03
1.84E-03 1.84E-03
1.90E-03 1.90E-03
1.83E-03 1.81E-03
1.79E-03 1.79E-03
1.83E-03 1.83E-03
1.79E-03 1.81E-03
1.79E-03 1.81E-03
2.00E-03 2.02E-03
1.83E-03 1.84E-03
1.79E-03 1.79E-03
50
1.77E-03
1.90E-03
1.96E-03
1.85E-03
1.85E-03
1.83E-03
1.83E-03
1.83E-03
2.08E-03
1.87E-03
1.77E-03
24-hr
Anneal
60
1.75E-03
1.88E-03
1.94E-03
1.83E-03
1.83E-03
1.83E-03
1.83E-03
1.83E-03
2.08E-03
1.86E-03
1.79E-03
168-hr
Anneal
70
1.79E-03
1.90E-03
1.94E-03
1.86E-03
1.83E-03
1.83E-03
1.83E-03
1.83E-03
2.06E-03
1.86E-03
1.79E-03
Biased Statistics
Average Biased
1.82E-03 1.79E-03 1.82E-03 1.82E-03 1.87E-03 1.85E-03 1.86E-03
Std Dev Biased
5.07E-05 5.23E-05 5.82E-05 5.85E-05 7.32E-05 7.26E-05 6.21E-05
Ps90%/90% (+KTL) Biased
1.96E-03 1.93E-03 1.98E-03 1.98E-03 2.07E-03 2.04E-03 2.03E-03
Ps90%/90% (-KTL) Biased
1.68E-03 1.64E-03 1.66E-03 1.66E-03 1.66E-03 1.65E-03 1.69E-03
Un-Biased Statistics
Average Un-Biased
1.83E-03 1.84E-03 1.85E-03 1.86E-03 1.88E-03 1.88E-03 1.88E-03
Std Dev Un-Biased
8.77E-05 9.37E-05 9.08E-05 9.02E-05 1.10E-04 1.11E-04 1.04E-04
Ps90%/90% (+KTL) Un-Biased
2.07E-03 2.09E-03 2.09E-03 2.11E-03 2.19E-03 2.19E-03 2.16E-03
Ps90%/90% (-KTL) Un-Biased
1.59E-03 1.58E-03 1.60E-03 1.61E-03 1.58E-03 1.58E-03 1.60E-03
Specification MAX
5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03 5.00E-03
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
33
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Current Limit 1 (A) @ VIN-VOUT=15V
2.50E+00
2.00E+00
1.50E+00
1.00E+00
5.00E-01
0.00E+00
0
10
20
30
40
50
24-hr
60
Anneal
168-hr
70
Anneal
Total Dose (krad(Si))
Figure 5.14. Plot of Current Limit 1 (A) @ VIN-VOUT=15V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
34
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.14. Raw data for Current Limit 1 (A) @ VIN-VOUT=15V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Current Limit 1 (A)
@ VIN-VOUT=15V
Device
2
6
7
8
10
11
14
17
19
20
51
0
2.19E+00
2.22E+00
2.20E+00
2.14E+00
2.23E+00
2.23E+00
2.18E+00
2.16E+00
2.34E+00
2.17E+00
2.19E+00
Biased Statistics
Average Biased
2.20E+00
Std Dev Biased
3.45E-02
Ps90%/90% (+KTL) Biased
2.29E+00
Ps90%/90% (-KTL) Biased
2.10E+00
Un-Biased Statistics
Average Un-Biased
2.22E+00
Std Dev Un-Biased
7.19E-02
Ps90%/90% (+KTL) Un-Biased 2.41E+00
Ps90%/90% (-KTL) Un-Biased
2.02E+00
Specification MIN
1.50E+00
Status
PASS
Total
10
2.20E+00
2.25E+00
2.24E+00
2.16E+00
2.26E+00
2.25E+00
2.21E+00
2.20E+00
2.38E+00
2.22E+00
2.19E+00
Dose (krad(Si))
20
30
2.22E+00 2.23E+00
2.28E+00 2.30E+00
2.26E+00 2.28E+00
2.17E+00 2.19E+00
2.29E+00 2.31E+00
2.27E+00 2.29E+00
2.23E+00 2.25E+00
2.22E+00 2.25E+00
2.41E+00 2.45E+00
2.25E+00 2.27E+00
2.19E+00 2.19E+00
50
2.25E+00
2.33E+00
2.32E+00
2.21E+00
2.34E+00
2.30E+00
2.28E+00
2.27E+00
2.49E+00
2.30E+00
2.19E+00
24-hr
Anneal
60
2.25E+00
2.33E+00
2.31E+00
2.21E+00
2.34E+00
2.30E+00
2.28E+00
2.28E+00
2.49E+00
2.30E+00
2.19E+00
168-hr
Anneal
70
2.24E+00
2.31E+00
2.29E+00
2.20E+00
2.32E+00
2.28E+00
2.25E+00
2.25E+00
2.43E+00
2.25E+00
2.19E+00
2.22E+00 2.24E+00 2.26E+00 2.29E+00 2.29E+00 2.27E+00
4.35E-02 4.93E-02 5.36E-02 5.78E-02 5.54E-02 5.01E-02
2.34E+00 2.38E+00 2.41E+00 2.45E+00 2.44E+00 2.41E+00
2.10E+00 2.11E+00 2.12E+00 2.13E+00 2.14E+00 2.14E+00
2.25E+00
7.43E-02
2.46E+00
2.05E+00
1.50E+00
PASS
2.28E+00
7.81E-02
2.49E+00
2.06E+00
1.50E+00
PASS
2.30E+00
8.23E-02
2.53E+00
2.08E+00
1.50E+00
PASS
2.33E+00
9.15E-02
2.58E+00
2.08E+00
1.50E+00
PASS
An ISO 9001:2008 and DSCC Certified Company
35
2.33E+00
8.79E-02
2.57E+00
2.09E+00
1.50E+00
PASS
2.29E+00
7.57E-02
2.50E+00
2.08E+00
1.50E+00
PASS
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Average Biased
Average Un-Biased
Ps90%/90% (-KTL) Un-Biased
Specification MIN
Ps90%/90% (-KTL) Biased
Current Limit 2 (A) @ VIN-VOUT=40V
7.00E-01
6.00E-01
5.00E-01
4.00E-01
3.00E-01
2.00E-01
1.00E-01
0.00E+00
0
10
20
30
40
50
Total Dose (krad(Si))
24-hr
60
Anneal
168-hr
70
Anneal
Figure 5.15. Plot of Current Limit 2 (A) @ VIN-VOUT=40V versus total dose. The solid diamonds are the
average of the measured data points for the samples irradiated under electrical bias while the shaded diamonds are
the average of the measured data points for the samples irradiated with all pins tied to ground. The black lines
(solid and/or dashed) are the average of the data points after application of the KTL statistics on the samples
irradiated under electrical bias while the gray lines (solid and/or dashed) are the average of the data points after
application of the KTL statistics on the samples irradiated in the unbiased condition. The red dotted line(s) are the
pre- and/or post-irradiation minimum and/or maximum specification value as defined in the datasheet and/or test
plan.
An ISO 9001:2008 and DSCC Certified Company
36
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table 5.15. Raw data for Current Limit 2 (A) @ VIN-VOUT=40V versus total dose, including the statistical
analysis, specification and the status of the testing (pass/fail).
Current Limit 2 (A)
@ VIN-VOUT=40V
Device
2
6
7
8
10
11
14
17
19
20
51
0
5.35E-01
5.24E-01
5.13E-01
5.13E-01
5.19E-01
5.35E-01
5.13E-01
5.13E-01
5.69E-01
5.02E-01
5.08E-01
Total
10
5.58E-01
5.69E-01
5.69E-01
5.35E-01
5.63E-01
5.63E-01
5.58E-01
5.52E-01
6.24E-01
5.63E-01
5.08E-01
Dose (krad(Si))
20
30
5.69E-01 5.91E-01
5.86E-01 6.08E-01
5.91E-01 6.13E-01
5.36E-01 5.63E-01
5.86E-01 6.13E-01
5.80E-01 5.91E-01
5.80E-01 6.02E-01
5.80E-01 6.13E-01
6.58E-01 6.91E-01
5.86E-01 6.13E-01
5.08E-01 5.08E-01
50
6.13E-01
6.41E-01
6.46E-01
5.85E-01
6.46E-01
6.19E-01
6.35E-01
6.41E-01
7.41E-01
6.46E-01
5.08E-01
24-hr
Anneal
60
6.08E-01
6.52E-01
6.52E-01
5.86E-01
6.52E-01
6.13E-01
6.35E-01
6.41E-01
7.35E-01
6.47E-01
5.13E-01
168-hr
Anneal
70
6.03E-01
6.25E-01
6.25E-01
5.75E-01
6.30E-01
5.92E-01
5.97E-01
6.03E-01
6.69E-01
5.97E-01
5.08E-01
Biased Statistics
Average Biased
5.21E-01 5.59E-01 5.74E-01 5.98E-01 6.26E-01 6.30E-01 6.12E-01
Std Dev Biased
9.18E-03 1.41E-02 2.26E-02 2.13E-02 2.68E-02 3.11E-02 2.30E-02
Ps90%/90% (+KTL) Biased
5.46E-01 5.97E-01 6.36E-01 6.56E-01 7.00E-01 7.15E-01 6.75E-01
Ps90%/90% (-KTL) Biased
4.96E-01 5.20E-01 5.12E-01 5.39E-01 5.53E-01 5.45E-01 5.49E-01
Un-Biased Statistics
Average Un-Biased
5.26E-01 5.72E-01 5.97E-01 6.22E-01 6.56E-01 6.54E-01 6.12E-01
Std Dev Un-Biased
2.67E-02 2.94E-02 3.43E-02 3.96E-02 4.84E-02 4.70E-02 3.23E-02
Ps90%/90% (+KTL) Un-Biased
6.00E-01 6.53E-01 6.91E-01 7.31E-01 7.89E-01 7.83E-01 7.00E-01
Ps90%/90% (-KTL) Un-Biased
4.53E-01 4.91E-01 5.03E-01 5.13E-01 5.24E-01 5.25E-01 5.23E-01
Specification MIN
3.00E-01 3.00E-01 3.00E-01 3.00E-01 3.00E-01 3.00E-01 3.00E-01
Status
PASS
PASS
PASS
PASS
PASS
PASS
PASS
An ISO 9001:2008 and DSCC Certified Company
37
ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
6.0. Summary / Conclusions
The low dose rate testing described in this final report was performed using the facilities at Aeroflex
RAD's Longmire Laboratories in Colorado Springs, CO. The low dose rate source is a GB-150 irradiator
modified to provide a panoramic exposure. The Co-60 rods are held in the base of the irradiator heavily
shielded by lead. During the irradiation exposures the rod is raised by an electronic timer/controller and
the exposure is performed in air. The dose rate for this irradiator in this configuration ranges from
approximately 1mrad(Si)/s to a maximum of approximately 50rad(Si)/s, determined by the distance
from the source.
The parametric data was obtained as "read and record" and all the raw data plus an attributes summary
are contained in this report as well as in a separate Excel file. The attributes data contains the average,
standard deviation and the average with the KTL values applied. The KTL value used in this work is
2.742 per MIL-HDBK-814 using one sided tolerance limits of 90/90 and a 5-piece sample size. The
90/90 KTL values were selected to match the statistical levels specified in the MIL-PRF-38535
sampling plan for the qualification of a radiation hardness assured (RHA) component. Note that the
following criteria must be met for a device to pass the low dose rate test: following the radiation
exposure each of the 5 pieces irradiated under electrical bias shall pass the specification value. The units
irradiated without electrical bias and the KTL statistics are included in this report for reference only. If
any of the 5 pieces irradiated under electrical bias exceed the device post radiation data sheet
specification limits, then the lot could be logged as a failure.
Based on this criterion the RH117K Positive Adjustable Regulator (from the lot traceability information
provided on the first page of this test report) PASSED the enhanced low dose rate sensitivity test to the
maximum tested dose level of 50krad(Si) with all parameters remaining within their datasheet
specifications.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Appendix A: Photograph of Packing Label and a Sample Unit-Under-Test to Show Part
Traceability
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Appendix B: Radiation Bias Connections and Absolute Maximum Ratings
ELDRS Radiation Biased Conditions: Extracted from Linear Technology Linear Technology RH117
Datasheet Revision B.
Pin
1
Function
Connection / Bias
ADJUST
2kΩ Resistor To -15V
To 15V,
2
INPUT
0.1µF decoupling To -15V
3 (Case) OUTPUT 61.9Ω Resistor To -15V
Figure B.1. Irradiation bias circuit. This figure was extracted from Linear Technology Linear Technology RH117
Datasheet Revision B.
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ELDRS Report
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Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
ELDRS Radiation Unbiased Conditions: All Pins grounded
Pin
Function Connection / Bias
1
ADJUST
GND
2
INPUT
GND
3 (Case) OUTPUT GND
Figure B.2. K Package drawing (for reference only). This figure was extracted from Linear Technology Linear
Technology RH117 Datasheet Revision B.
Absolute Maximum Ratings:
Parameter
Max Rating
Power Dissipation
Internally Limited
Input-to-output Differential
40V
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Appendix C: Electrical Test Parameters and Conditions
The expected ranges of values as well as the measurement conditions are taken from Linear Technology
Linear Technology RH117 Datasheet Revision B. All electrical tests for this device are performed on
one of Aeroflex RAD's LTS2020 Test Systems. The LTS2020 Test System is a programmable
parametric tester that provides parameter measurements for a variety of digital, analog and mixed signal
products including voltage regulators, voltage comparators, D to A and A to D converters. The LTS2020
Test System achieves accuracy and sensitivity through the use of software self-calibration and an
internal relay matrix with separate family boards and custom personality adapter boards. The tester uses
this relay matrix to connect the required test circuits, select the appropriate voltage / current sources and
establish the needed measurement loops for all the tests performed. The measured parameters and test
conditions are shown in Table C.1.
A listing of the measurement precision/resolution for each parameter is shown in Table C.2. The
precision/resolution values were obtained from test data or from the DAC resolution of the LTS-2020
for the particular test shown, whichever is greater. To generate the precision/resolution shown in Table
C.2, one of the units-under-test was tested repetitively (a total of 10-times with re-insertion between
tests) to obtain the average test value and standard deviation. Using this test data MIL-HDBK-814 90/90
KTL statistics were applied to the measured standard deviation to generate the final measurement range.
This value encompasses the precision/resolution of all aspects of the test system, including the LTS2020
mainframe, family board, socket assembly and DUT board as well as insertion error. In some cases, the
measurement resolution is limited by the internal DACs, which results in a measured standard deviation
of zero. In these instances the precision/resolution will be reported back as the LSB of the DAC.
Note that the testing and statistics used in this document are based on an “analysis of variables”
technique, which relies on small sample sizes to qualify much larger lot sizes (see MIL-HDBK-814, p.
91 for a discussion of statistical treatments). Not all measured parameters are well suited to this
approach due to inherent large variations. If necessary, larger samples sizes could be used to qualify
these parameters using an “attributes” approach.
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ELDRS Report
12-979 130327 R1.0
Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Table C.1. Measured parameters and test conditions for the RH117K Positive Adjustable Regulator.
Parameter
Symbol
Test Conditions
Reference Voltage 1 (V)
VREF1
VDIFF=3V, IL=10mA
Reference Voltage 2 (V)
VREF2
VDIFF=40V, IL=10mA
Reference Voltage 3 (V)
VREF3
VDIFF=3V, IL=1.5A
Reference Voltage 4 (V)
VREF4
VDIFF=40V, IL=0.3A
Line Regulation (%/V)
LINE REG
VDIFF=3V TO 40V, IL=10mA
Load Regulation 1 (V)
LOAD REG1 VOUT<=5V, IL=10mA TO 1.5A
Load Regulation 2 (%)
LOAD REG2
VOUT>=5V, IL=10mA TO 1.5A
Adjust Pin Current 1 (A)
IADJ1
VDIFF=2.5V, IL=10mA
Adjust Pin Current 2 (A)
IADJ2
VDIFF=5V, IL=10mA
Adjust Pin Current 3 (A)
IADJ3
VDIFF=40V, IL=10mA
Adjust Pin Current Change 1 (A) ∆IADJ1
VDIFF=5V, IL=10mA TO 1.5A
Adjust Pin Current Change 2 (A) ∆IADJ2
VDIFF=2.5V TO 40V, IL=10mA
Minimum Load Current (A)
IMIN
VDIFF=40V
Current Limit 1 (A)
ISC1
VIN-VOUT=15V
Current Limit 2 (A)
ISC2
VIN-VOUT=40V
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ELDRS Report
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Aeroflex RAD
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Colorado Springs, CO 80919
(719) 531-0800
Table C.2. Measured parameters, pre-irradiation specifications and measurement precision for the RH117K
Positive Adjustable Regulator.
Pre-Irradiation Specification
Parameter
Measurement Precision/Resolution
MIN
MAX
Reference Voltage 1 (V)
1.20E+00
1.30E+00
±8.71E-04
Reference Voltage 2 (V)
1.20E+00
1.30E+00
±6.53E-04
Reference Voltage 3 (V)
1.20E+00
1.30E+00
±6.53E-04
Reference Voltage 4 (V)
1.20E+00
1.30E+00
±8.71E-04
Line Regulation (%/V)
2.00E-02
±2.27E-04
Load Regulation 1 (V)
1.50E-02
±1.65E-04
3.00E-01
±1.82E-02
Adjust Pin Current 1 (A)
1.00E-04
±3.75E-07
Adjust Pin Current 2 (A)
1.00E-04
±3.67E-07
Adjust Pin Current 3 (A)
1.00E-04
±2.01E-07
Load Regulation 2 (%)
-3.00E-01
Adjust Pin Current Change 1 (A)
-5.00E-06
5.00E-06
±6.01E-07
Adjust Pin Current Change 2 (A)
-5.00E-06
5.00E-06
±2.66E-07
5.00E-03
±1.71E-05
Minimum Load Current (A)
Current Limit 1 (A)
1.50E+00
±7.59E-03
Current Limit 2 (A)
3.00E-01
±7.69E-03
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ELDRS Report
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Aeroflex RAD
5017 N. 30th Street
Colorado Springs, CO 80919
(719) 531-0800
Appendix D: List of Figures Used in the Results Section (Section 5)
5.1.
5.2.
5.3.
5.4.
5.5.
5.6.
5.7.
5.8.
5.9.
5.10.
5.11.
5.12.
5.13.
5.14.
5.15.
Reference Voltage 1 (V) @ VDIFF=3V, IL=10mA
Reference Voltage 2 (V) @ VDIFF=40V, IL=10mA
Reference Voltage 3 (V) @ VDIFF=3V, IL=1.5A
Reference Voltage 4 (V) @ VDIFF=40V, IL=0.3A
Line Regulation (%/V) @ VDIFF=3V TO 40V, IL=10mA
Load Regulation 1 (V) @ VOUT<=5V, IL=10mA TO 1.5A
Load Regulation 2 (%) @ VOUT>=5V, IL=10mA TO 1.5A
Adjust Pin Current 1 (A) @ VDIFF=2.5V, IL=10mA
Adjust Pin Current 2 (A) @ VDIFF=5V, IL=10mA
Adjust Pin Current 3 (A) @ VDIFF=40V, IL=10mA
Adjust Pin Current Change 1 (A) @ VDIFF=5V, IL=10mA TO 1.5A
Adjust Pin Current Change 2 (A) @ VDIFF=2.5V TO 40V, IL=10mA
Minimum Load Current (A) @ VDIFF=40V
Current Limit 1 (A) @ VIN-VOUT=15V
Current Limit 2 (A) @ VIN-VOUT=40V
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