TID LDR RH1086MH W1231270.1 W4 Total Ionization Dose (TID) Test Results of the RH1086MH 0.5A Low Dropout Positive Adjustable Regulator @ Low Dose Rate (LDR) LDR = 10 mrads(Si)/s 20 November 2014 Duc Nguyen, Sana Rezgui Acknowledgements The authors would like to thank the Product Engineering and Design S-Power groups from Linear Technology for their help with the board design and assembly as well as the data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd from Defense Microelectronics Activity (DMEA) for the extensive work for board setup and continuous dosimetry monitoring throughout the ELDRS tests. P a g e 1 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 TID LDR Testing of the RH1086MH 0.5A Low Dropout Positive Adjustable Regulator Part Type Tested: RH1086MH 0.5A Low Dropout Positive Adjustable Regulator Traceability Information: Fab Lot # W1231270.1; Assembly Lot # 719601.1; Wafer # 4; Date Code 1328A. See photograph of unit under test in Appendix A. Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units for unbiased irradiation. Serial numbers 667-671 had all pins tied to ground during irradiation. Serial numbers 662-666 were biased during irradiation. Serial numbers 660 and 661 were used as control. See Appendix B for the radiation bias connection tables. Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test increments: 10 Krads(Si), 20 Krads(Si), 50 Krads(Si), 73 Krads(Si), 107 Krads(Si). Radiation dose: 10 mrads(Si)/sec. Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D. Test Hardware and Software: LTX pre- and post-irradiation test program EFCR1086H.02. Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60. Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883 and MIL-STD-750. SUMMARY ALL 12 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT. ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST. P a g e 2 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 1.0 Overview and Background Among other radiation effects, Total Ionizing Dose (TID) may affect electrical characteristics, causing parametric and/or functional failures in integrated circuits. During gamma-irradiations, TID-induced and transported electron-hole pairs may result in charge trapping in a transistor’s dielectrics and interface regions, affecting the device’s basic features. Such effects warrant testing and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE) may take place, depending on the circuit’s design and process technology. Hence the requirement per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in TM1019, MIL-STD-883 is to not exceed the allowed time from the end of an incremented irradiation and an electrical test to more than one hour. Additionally, the total time from the end of one incremental irradiation to the start of the next incremental step should be less than two hours. 2.0 Radiation Facility and Test Equipment The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento, California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10 mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate verified by ion chamber detectors. See Appendix C for the certificate of dosimetry. 3.0 Test Conditions The 10 samples were placed in a lead/aluminum container and aligned with the radiation source, Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at +/- 15V and other five had all pads grounded. The devices were irradiated up to 107 Krad(Si) with increments of 10, 20, 50, 73 Krads(Si). After each irradiation, the samples were transported in dry ice to Linear Technology testing facility. Testing was performed on the two control units to confirm the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2 control). The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must pass the datasheet limits. If any of the tested parameters of these five units do not meet the required limits then a failure-analysis of the part should be conducted and if valid the lot will be scrapped. P a g e 3 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 4.0 Tested Parameters The following parameters were measured pre- and post-irradiations: - VREF (V) @ 10mA ≤ IOUT ≤ IFULL LOAD, 1.5V ≤ (VIN – VOUT) ≤ 15V Line Regulation (%) @ ILOAD = 10mA, 1.5V ≤ (VIN – VOUT) ≤ 15V Load Regulation (%) @ (VIN – VOUT) = 3V, 10mA ≤ IOUT ≤ IFULL LOAD Dropout Voltage (V) @ IOUT = 0.5A, VREF = 1% Current Limit (A) @ (VIN – VOUT) = 5V Current Limit (A) @ (VIN – VOUT) = 25V Minimum Load Current (mA) @ (VIN – VOUT) = 25V Adjust Pin Current (uA) Delta Adjust Current (uA) @ 10mA ≤ IOUT ≤ IFULL LOAD, 1.5V ≤ (VIN – VOUT) ≤ 15V Appendix D details the test conditions, minimum and maximum values at different accumulated doses. P a g e 4 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 5.0 Test Results All ten samples passed the post-irradiation electrical tests. All measurements of the nine listed parameters in section 4.0 are within the specification limits. The used statistics in this report are based on the tolerance limits, which are bounds to gage the quality of the manufactured products. It assumes that if the quality of the items is normally distributed with known mean and known standard deviation, the two-sided tolerance limits can be calculated as follows: +KTL = mean + (KTL) (standard deviation) -KTL = mean - (KTL) (standard deviation) Where +KTL is the upper tolerance limit and -KTL is the lower tolerance limit. These tolerance limits are defined in a table of inverse normal probability distribution. However, in most cases, mean and standard deviations are unknown and therefore it is practical to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor in this report is 2.742. In the plots, the dotted lines with diamond markers are the average of the measured data points of five samples irradiated under electrical bias while the dashed lines with X-markers are the average of measured data points of five units irradiated with all pins tied to ground. The solid lines with triangle markers are the average of the data points after the calculation of the K TL statistics on the sample irradiated in the biased setup. The solid lines with square symbols are the average of the measured points after the application of the KTL statistics on the five samples irradiated with all pins grounded. The orange solid lines with circle markers are the specification limits. The 107 Krads(Si) test limits are using Linear Technology datasheet 100 Krads(Si) specification limits. P a g e 5 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 VREF (V) @ 10mA≤ IOUT ≤ IFULL LOAD; 1.5V≤ VIN - VOUT ≤ 15V 1.280 Specification MAX 1.270 Ps90%/90% (+KTL) Biased 1.260 Ps90%/90% (+KTL) All GND'd 1.250 Average All GND'd 1.240 Ps90%/90% (-KTL) All GND'd 1.230 Average Biased 1.220 Ps90%/90% (-KTL) Biased 1.210 Specification MIN 1.200 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.1 Plot of Reference Voltage versus Total Dose The measured data of 10 samples are within datasheet specification limits. Note the 107 Krads(Si) computed +KTL biased data point is slightly lower than the maximum limit due to the small 5piece sample size. P a g e 6 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.1: Raw data for reference voltage at full load versus total dose including the statistical calculations, minimum specification, maximum specification, and the status of the test (PASS/FAIL) under the orange headers) Parameter Units 667 668 669 670 671 662 663 664 665 666 660 661 Vref @ 10mA≤ IOUT ≤ IFULL LOAD; 1.5V≤ VIN - VOUT ≤ 15V (V) 0 All GND'd Irradiation 1.25124 All GND'd Irradiation 1.25552 All GND'd Irradiation 1.25060 All GND'd Irradiation 1.24655 All GND'd Irradiation 1.25296 Biased Irradiation 1.25491 Biased Irradiation 1.25593 Biased Irradiation 1.25135 Biased Irradiation 1.25220 Biased Irradiation 1.25342 Control Unit 1.25617 Control Unit 1.25674 All GND'd Irradiation Statistics Average All GND'd 1.25138 Std Dev All GND'd 0.00330 Ps90%/90% (+KTL) All GND'd 1.26042 Ps90%/90% (-KTL) All GND'd 1.24233 Biased Irradiation Statistics Average Biased 1.25356 Std Dev Biased 0.00188 Ps90%/90% (+KTL) Biased 1.25872 Ps90%/90% (-KTL) Biased 1.24840 Specification MIN 1.225 Status (Measurements) All GND'd PASS Status (Measurements) Biased PASS Specification MAX 1.270 Status (Measurements) All GND'd PASS Status (Measurements) Biased PASS Total Dose (Krads(Si)) @ 10 mrads(Si)/s 10 1.25185 1.25352 1.25484 1.25422 1.25215 1.25207 1.25093 1.24981 1.25169 1.25387 1.25474 1.25185 20 1.25142 1.25302 1.25440 1.25383 1.25180 1.24983 1.24864 1.24753 1.24952 1.25170 1.25461 1.25645 50 1.25067 1.25195 1.25325 1.25287 1.25051 1.24366 1.24210 1.24115 1.24282 1.24599 1.25409 1.25658 73 1.24991 1.25111 1.25227 1.25196 1.24935 1.23909 1.23696 1.23600 1.23754 1.24150 1.25386 1.25600 107 1.24922 1.25028 1.25144 1.25129 1.24777 1.25415 1.23045 1.22988 1.23102 1.23558 1.25402 1.25644 1.25331 0.00129 1.25686 1.24977 1.25290 0.00128 1.25640 1.24939 1.25185 0.00124 1.25526 1.24844 1.25092 0.00127 1.25439 1.24744 1.25000 0.00153 1.25420 1.24581 1.25168 0.00150 1.25579 1.24756 1.220 PASS PASS 1.275 PASS PASS 1.24944 0.00154 1.25368 1.24521 1.219 PASS PASS 1.275 PASS PASS 1.24314 0.00184 1.24818 1.23810 1.215 PASS PASS 1.275 PASS PASS 1.23822 0.00215 1.24411 1.23233 1.23621 0.01027 1.26439 1.20804 1.210 PASS PASS 1.275 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS PASS PASS PASS FAIL PASS P a g e 7 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Line Regulation (%) @ IOUT=10mA; 1.5V≤ VIN-VOUT ≤15V 0.30 Specification MAX 0.25 Ps90%/90% (+KTL) Biased 0.20 Average Biased 0.15 Ps90%/90% (+KTL) All GND'd 0.10 Average All GND'd 0.05 Ps90%/90% (-KTL) All GND'd 0.00 Ps90%/90% (-KTL) Biased -0.05 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.2: Plot of Line Regulation versus Total Dose P a g e 8 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.2: Raw data for line regulation versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL under the second orange header) Parameter Line Reg @ IOUT =10mA; 1.5V VIN-VOUT 15V Units (%) 0 667 All GND'd Irradiation 0.00533 668 All GND'd Irradiation 0.00076 669 All GND'd Irradiation 0.00404 670 All GND'd Irradiation 0.00918 671 All GND'd Irradiation 0.00533 662 Biased Irradiation 0.01139 663 Biased Irradiation 0.00683 664 Biased Irradiation 0.00129 665 Biased Irradiation 0.00685 666 Biased Irradiation 0.00616 660 Control Unit 0.01291 661 Control Unit 0.00531 All GND'd Irradiation Statistics Average All GND'd 0.00493 Std Dev All GND'd 0.00302 Ps90%/90% (+KTL) All GND'd 0.01322 Ps90%/90% (-KTL) All GND'd -0.00336 Biased Irradiation Statistics Average Biased 0.00651 Std Dev Biased 0.00358 Ps90%/90% (+KTL) Biased 0.01633 Ps90%/90% (-KTL) Biased -0.00332 Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX 0.20 Status (Measurements) All GND'd PASS Status (Measurements) Biased PASS Total Dose (Krads(Si)) @ 10 mrads(Si)/s 10 0.00533 0.01225 0.00912 0.00532 0.00076 0.00305 0.00770 0.00763 0.01150 0.00844 0.00000 0.00914 20 0.00686 0.00685 0.00601 0.01293 0.00838 0.01076 0.00924 0.01452 0.01297 0.01143 0.00608 0.00531 50 0.01677 0.00990 0.00685 0.00533 0.01449 0.02461 0.02465 0.02390 0.02693 0.01998 0.01749 0.00228 73 0.01678 0.01372 0.01827 0.01066 0.02068 0.03925 0.02929 0.04552 0.03160 0.03610 0.00837 0.00911 107 0.02373 0.03035 0.02133 0.02423 0.02147 0.01217 0.04658 0.06196 0.05803 0.04932 0.00836 0.01017 0.00656 0.00435 0.01847 -0.00536 0.00820 0.00278 0.01582 0.00059 0.01067 0.00489 0.02407 -0.00274 0.01602 0.00392 0.02676 0.00528 0.02422 0.00366 0.03427 0.01417 0.00766 0.00303 0.01597 -0.00064 0.01178 0.00203 0.01736 0.00621 0.02401 0.00253 0.03095 0.01707 0.03635 0.00642 0.05396 0.01874 0.04561 0.01972 0.09967 -0.00845 0.20 PASS PASS 0.21 PASS PASS 0.23 PASS PASS 0.25 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 9 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Load Regulation (%) @ 10mA≤ IOUT ≤ IFULL LOAD ;VIN-VOUT=3V 0.40 Specification MAX 0.30 Ps90%/90% (+KTL) Biased 0.20 Ps90%/90% (+KTL) All GND'd Average Biased 0.10 Average All GND'd Ps90%/90% (-KTL) All GND'd 0.00 Ps90%/90% (-KTL) Biased -0.10 -0.20 -0.30 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.3: Plot of Load Regulation versus Total Dose P a g e 10 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.3: Raw data for load regulation versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL). Parameter Units 667 668 669 670 671 662 663 664 665 666 660 661 Load Reg @ 10mA≤ IOUT ≤ IFULL LOAD, VIN-VOUT =3V (%) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads(Si)/s 0 -0.10728 -0.11767 -0.10048 -0.00092 -0.03196 -0.07579 -0.05237 -0.12704 -0.10111 0.01689 0.00008 -0.02360 10 -0.00564 -0.01065 -0.00152 -0.00182 -0.00533 -0.01615 -0.00541 -0.01305 -0.00769 -0.00768 -0.01072 -0.00564 20 -0.01135 -0.01294 -0.01368 -0.00837 -0.00762 -0.01061 -0.01153 -0.00688 -0.00153 -0.00609 -0.01285 -0.00531 50 -0.00839 -0.01066 -0.00989 -0.00830 -0.01380 -0.02078 -0.01082 -0.02151 -0.01696 -0.02372 -0.00304 -0.01214 73 -0.02136 -0.02591 -0.01447 -0.01523 -0.01984 -0.02616 -0.01310 -0.02083 -0.01002 -0.01690 -0.00844 -0.01139 107 -0.02122 -0.02371 -0.02971 -0.01836 -0.02605 -0.00608 -0.02410 -0.01783 -0.01448 -0.02454 -0.00608 -0.01708 -0.07166 0.05195 0.07080 -0.21412 -0.00499 0.00370 0.00514 -0.01513 -0.01079 0.00270 -0.00338 -0.01821 -0.01021 0.00225 -0.00405 -0.01637 -0.01936 0.00469 -0.00649 -0.03223 -0.02381 0.00437 -0.01184 -0.03578 -0.06788 0.05499 0.08289 -0.21866 -0.01000 0.00444 0.00217 -0.02217 -0.00733 0.00399 0.00362 -0.01828 -0.01876 0.00506 -0.00488 -0.03264 -0.01740 0.00636 0.00003 -0.03484 -0.01741 0.00763 0.00350 -0.03831 0.3 PASS PASS 0.3 PASS PASS 0.3 PASS PASS 0.3 PASS PASS 0.3 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 11 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 1.30 Specification MAX Dropout Voltage (V) @ IOUT = 0.5A 1.25 Ps90%/90% (+KTL) All GND'd 1.20 1.15 Ps90%/90% (+KTL) Biased 1.10 Average Biased 1.05 Average All GND'd 1.00 0.95 Ps90%/90% (-KTL) Biased 0.90 Ps90%/90% (-KTL) All GND'd 0.85 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.4: Plot of Dropout Voltage versus Total Dose P a g e 12 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.4: Raw data for dropout voltage versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL). Parameter Units 667 668 669 670 671 662 663 664 665 666 660 661 Dropout Voltage @ IOUT = 0.5A (V) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads(Si)/s 0 0.95429 0.96995 0.96002 0.97070 0.95784 0.96438 0.96148 0.96517 0.95503 0.95735 0.96246 0.96399 10 0.94160 0.94842 0.94865 0.94659 0.94339 0.93989 0.94958 0.94431 0.96401 0.95912 0.92021 0.95474 20 0.94231 0.94895 0.94765 0.94418 0.94255 0.94948 0.95286 0.94582 0.95510 0.96020 0.92577 0.93904 50 0.94365 0.95059 0.95033 0.94578 0.94222 0.95632 0.95434 0.94465 0.96067 0.96312 0.93924 0.93908 73 0.94524 0.95245 0.95276 0.94833 0.94650 0.95795 0.95654 0.95128 0.96194 0.96485 0.94273 0.93731 107 0.94335 0.95869 0.91632 0.95290 0.90158 0.93707 0.96606 0.95968 0.97113 0.97281 0.93831 0.93276 0.96256 0.00738 0.98280 0.94232 0.94573 0.00312 0.95429 0.93716 0.94513 0.00302 0.95341 0.93684 0.94651 0.00382 0.95698 0.93605 0.94906 0.00342 0.95844 0.93968 0.93457 0.02458 1.00196 0.86718 0.96068 0.00440 0.97275 0.94861 0.95138 0.01006 0.97895 0.92381 0.95269 0.00547 0.96770 0.93769 0.95582 0.00714 0.97540 0.93624 0.95851 0.00521 0.97279 0.94423 0.96135 0.01450 1.00112 0.92158 1.25 PASS PASS 1.25 PASS PASS 1.26 PASS PASS 1.27 PASS PASS 1.29 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 13 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Current Limit (A) @ VIN - VOUT = 5V 1.20 1.10 Ps90%/90% (+KTL) All GND'd 1.00 Ps90%/90% (+KTL) Biased 0.90 Average All GND'd 0.80 Average Biased 0.70 Ps90%/90% (-KTL) Biased 0.60 Ps90%/90% (-KTL) All GND'd 0.50 Specification MIN 0.40 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.5: Plot of Current Limit versus Total Dose P a g e 14 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.5: Raw data for current limit versus total dose including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL) Parameter Units 667 668 669 670 671 662 663 664 665 666 660 661 Current Limit (A) @ VIN - VOUT = 5V (A) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads(Si)/s 0 0.90094 0.88998 0.91463 0.89800 0.90634 0.89635 0.89857 0.76807 0.90205 0.76528 0.75971 0.89711 10 0.90733 0.90337 0.75427 0.76303 0.90438 0.76702 0.77043 0.76628 0.76729 0.90774 0.88028 0.77171 20 0.90406 0.90065 0.75119 0.75867 0.90065 0.76764 0.76852 0.76593 0.76135 0.90594 0.87549 0.89779 50 0.89946 0.89646 0.74592 0.75274 0.89571 0.76347 0.76280 0.75642 0.75795 0.90340 0.86815 0.88597 73 0.91953 0.91638 0.76637 0.77222 0.91649 0.78303 0.78201 0.77681 0.77703 0.92379 0.88825 0.90136 107 0.92311 0.92448 0.76301 0.77847 0.91201 0.88726 0.78774 0.78184 0.78209 0.92892 0.88786 0.90272 0.90198 0.00922 0.92725 0.87670 0.84648 0.08025 1.06651 0.62644 0.84304 0.08049 1.06375 0.62233 0.83805 0.08104 1.06028 0.61583 0.85820 0.08119 1.08083 0.63557 0.86022 0.08200 1.08507 0.63536 0.84606 0.07251 1.04487 0.64725 0.5 PASS PASS 0.79575 0.06263 0.96747 0.62403 0.5 PASS PASS 0.79388 0.06271 0.96582 0.62193 0.5 PASS PASS 0.78881 0.06413 0.96466 0.61296 0.5 PASS PASS 0.80853 0.06449 0.98537 0.63170 0.83357 0.06964 1.02453 0.64261 0.5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 15 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Current Limit (A) @ VIN - VOUT = 25V 0.095 Ps90%/90% (+KTL) All GND'd 0.085 0.075 Average Biased 0.065 Ps90%/90% (+KTL) Biased 0.055 Ps90%/90% (-KTL) Biased 0.045 Average All GND'd 0.035 Ps90%/90% (-KTL) All GND'd 0.025 Specification MIN 0.015 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.6: Plot of Current Limit @ 25V versus Total Dose P a g e 16 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.6: Raw data for current limit versus total dose including the statistical calculations, minimum specification, and the status of the test (PASS/FAIL) Parameter Current Limit (A) @ VIN - VOUT = 25V Units (A) 667 All GND'd Irradiation 668 All GND'd Irradiation 669 All GND'd Irradiation 670 All GND'd Irradiation 671 All GND'd Irradiation 662 Biased Irradiation 663 Biased Irradiation 664 Biased Irradiation 665 Biased Irradiation 666 Biased Irradiation 660 Control Unit 661 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads(Si)/s 0 0.07617 0.07455 0.07628 0.07457 0.07569 0.07475 0.07453 0.07611 0.07628 0.07518 0.07456 0.07399 10 0.07663 0.07562 0.07571 0.07594 0.07665 0.07299 0.07714 0.07636 0.07801 0.07462 0.06957 0.07667 20 0.07331 0.07205 0.07185 0.07190 0.07263 0.07155 0.07428 0.07348 0.07218 0.07042 0.06771 0.07145 50 0.05801 0.05729 0.05681 0.05702 0.05729 0.05782 0.05873 0.05665 0.05713 0.05636 0.05672 0.05663 73 0.07247 0.07134 0.07193 0.07191 0.07234 0.07198 0.07371 0.07158 0.07167 0.07063 0.07300 0.07126 107 0.07362 0.07458 0.06379 0.07463 0.06285 0.07318 0.07653 0.07565 0.07503 0.07350 0.07381 0.07264 0.07545 0.00084 0.07777 0.07314 0.07611 0.00050 0.07748 0.07475 0.07235 0.00062 0.07405 0.07065 0.05728 0.00045 0.05852 0.05604 0.07200 0.00044 0.07321 0.07079 0.06989 0.00602 0.08641 0.05338 0.07537 0.00079 0.07754 0.07320 0.02 PASS PASS 0.07582 0.00202 0.08135 0.07029 0.02 PASS PASS 0.07238 0.00153 0.07659 0.06818 0.019 PASS PASS 0.05734 0.00096 0.05996 0.05472 0.019 PASS PASS 0.07191 0.00112 0.07499 0.06883 0.07478 0.00142 0.07868 0.07088 0.018 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 17 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Minimum Load Current @ VIN - VOUT = 25V 11.00 Specification MAX 10.00 9.00 Ps90%/90% (+KTL) All GND'd 8.00 Average All GND'd 7.00 Ps90%/90% (+KTL) Biased 6.00 Average Biased 5.00 4.00 Ps90%/90% (-KTL) All GND'd 3.00 Ps90%/90% (-KTL) Biased 2.00 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.7: Plot of Minimum Load Current versus Total Dose The average measured values of 10 samples pass the datasheet specification maximum limit. P a g e 18 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.7: Raw data table for minimum load current versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Minimum Load Current @ VIN - VOUT = 25V Units (mA) 667 All GND'd Irradiation 668 All GND'd Irradiation 669 All GND'd Irradiation 670 All GND'd Irradiation 671 All GND'd Irradiation 662 Biased Irradiation 663 Biased Irradiation 664 Biased Irradiation 665 Biased Irradiation 666 Biased Irradiation 660 Control Unit 661 Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased Total Dose (Krads(Si)) @ 10 mrads(Si)/s 0 2.82694 2.81329 2.85721 2.79644 2.81352 2.78401 2.77815 2.81543 2.84959 2.77884 2.78371 2.78890 10 2.83624 2.80123 2.80508 2.82557 2.82404 2.82680 2.87314 2.81598 2.78265 2.76954 2.91422 2.78934 20 2.82941 2.79928 2.80569 2.83201 2.82094 2.80943 2.86000 2.81004 2.80996 2.76175 2.90089 2.86915 50 2.84471 2.80581 2.80581 2.83310 2.83921 2.80688 2.87863 2.81809 2.80124 2.77005 2.86375 2.86666 73 2.84865 2.81266 2.81571 2.83707 2.83836 2.80420 2.87862 2.82174 2.81884 2.78133 2.86429 2.87115 107 2.86407 2.81375 2.91134 2.84881 2.94824 2.87748 2.88244 2.82374 2.82007 2.78340 2.87437 2.89083 2.82148 0.02272 2.88376 2.75920 2.81843 0.01478 2.85896 2.77791 2.81747 0.01445 2.85710 2.77783 2.82572 0.01864 2.87684 2.77461 2.83049 0.01558 2.87322 2.78777 2.87724 0.05295 3.02244 2.73205 2.80120 0.03111 2.88650 2.71590 2.81362 0.04069 2.92520 2.70204 2.81023 0.03474 2.90549 2.71498 2.81498 0.03979 2.92409 2.70586 2.82094 0.03599 2.91964 2.72225 2.83743 0.04195 2.95244 2.72241 10 PASS PASS 10 PASS PASS 10 PASS PASS 10 PASS PASS 10 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 19 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Adjust Pin Current (uA) 130.00 120.00 Specification MAX 110.00 Ps90%/90% (+KTL) All GND'd 100.00 Ps90%/90% (+KTL) Biased 90.00 80.00 Average All GND'd 70.00 Average Biased 60.00 Ps90%/90% (-KTL) Biased 50.00 Ps90%/90% (-KTL) All GND'd 40.00 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.8: Plot of Adjust Pin Current versus Total Dose P a g e 20 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.8: Raw data table for adjust pin current versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 667 668 669 670 671 662 663 664 665 666 660 661 Adjust Pin Current (uA) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased 0 51.46739 51.54274 52.17214 51.53872 51.26912 50.51411 50.75986 51.45809 52.05428 50.22866 50.69638 50.86432 Total Dose (Krads(Si)) @ 10 mrads(Si)/s 10 20 50 73 51.16077 51.13360 51.35074 51.49332 50.68806 50.64878 50.89056 51.09520 50.89416 51.09883 51.21584 51.10828 51.16346 51.47364 51.77897 51.59667 51.80642 51.95401 52.38297 52.07212 51.81381 50.50613 49.85899 49.70883 51.66335 51.31272 51.14656 51.04864 50.47853 50.27752 50.80077 49.93206 49.61465 50.52639 50.07566 49.97163 49.83895 49.84284 49.55891 49.47996 55.99811 54.86282 52.67405 52.26501 49.90421 53.07209 53.18373 53.24805 107 52.10466 50.56190 58.76696 51.42087 61.01048 52.93249 50.00793 49.09832 49.01781 48.61651 52.76613 53.96946 51.59802 51.14257 51.26177 51.52382 51.47312 54.77297 0.33964 0.42123 0.48549 0.57643 0.40324 4.76833 52.52932 52.29760 52.59300 53.10438 52.57880 67.84775 50.66672 49.98755 49.93055 49.94326 50.36744 41.69820 51.00300 50.68186 50.49312 50.28818 50.02822 49.93461 0.74331 1.01679 0.53441 0.66347 0.60339 1.75142 53.04115 53.46988 51.95847 52.10741 51.68271 54.73702 48.96485 47.89383 49.02777 48.46894 48.37374 45.13221 120 PASS PASS 120 PASS PASS 120 PASS PASS 120 PASS PASS 120 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 21 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Adjust Pin Current Change (uA) @ 10mA ≤ IOUT ≤ IFULL LOAD ; 1.5V ≤ VIN - VOUT ≤ 15V 6 Specification MAX 5 Ps90%/90% (+KTL) All GND'd 4 Ps90%/90% (+KTL) Biased 3 Average All GND'd 2 Average Biased Ps90%/90% (-KTL) All GND'd 1 Ps90%/90% (-KTL) Biased 0 0 20 40 60 80 100 120 Total Dose (Krads(Si)) Figure 5.9: Plot of Adjust Pin Current Change versus Total Dose P a g e 22 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table 5.9: Raw data table for adjust pin current change versus total dose including the statistical calculations, maximum specification, and the status of the test (PASS/FAIL) Parameter Units 667 668 669 670 671 662 663 664 665 666 660 661 Adj Pin I Change @ 10mA≤IOUT ≤IFULL LOAD; Total Dose (Krads(Si)) @ 10 mrads(Si)/s 1.5V≤VIN-VOUT ≤15V (uA) All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation All GND'd Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Biased Irradiation Control Unit Control Unit All GND'd Irradiation Statistics Average All GND'd Std Dev All GND'd Ps90%/90% (+KTL) All GND'd Ps90%/90% (-KTL) All GND'd Biased Irradiation Statistics Average Biased Std Dev Biased Ps90%/90% (+KTL) Biased Ps90%/90% (-KTL) Biased Specification MIN Status (Measurements) All GND'd Status (Measurements) Biased Specification MAX Status (Measurements) All GND'd Status (Measurements) Biased 0 0.48135 0.41860 0.35140 0.38688 0.37788 0.43090 0.41442 0.40064 0.39054 0.41349 0.39923 0.44066 10 0.34583 0.38151 0.35920 0.39203 0.32857 0.39632 0.33062 0.39657 0.28453 0.35550 0.44516 0.33420 20 0.42368 0.40238 0.31177 0.35283 0.32147 0.40865 0.35594 0.43047 0.32294 0.45191 0.41310 0.42321 50 0.28232 0.49347 0.40681 0.49311 0.48036 0.41517 0.28197 0.44817 0.42327 0.44575 0.44669 0.37922 73 0.38013 0.37982 0.34519 0.41106 0.35751 0.36377 0.33462 0.42177 0.32362 0.37478 0.34369 0.38192 107 0.42720 0.37144 0.33960 0.37104 0.29150 0.40536 0.31876 0.38200 0.38609 0.41783 0.43880 0.42305 0.40322 0.04984 0.53988 0.26657 0.36143 0.02583 0.43224 0.29061 0.36242 0.04920 0.49734 0.22751 0.43121 0.09067 0.67984 0.18259 0.37474 0.02522 0.44390 0.30559 0.36016 0.04969 0.49641 0.22391 0.41000 0.01528 0.45191 0.36809 0.35271 0.04735 0.48255 0.22287 0.39398 0.05338 0.54035 0.24762 0.40287 0.06906 0.59222 0.21352 0.36371 0.03856 0.46944 0.25798 0.38201 0.03823 0.48683 0.27719 5 PASS PASS 5 PASS PASS 5 PASS PASS 5 PASS PASS 5 PASS PASS Status (-KTL) All GND'd Status (+KTL) All GND'd PASS PASS PASS PASS PASS Status (-KTL) Biased Status (+KTL) Biased PASS PASS PASS PASS PASS P a g e 23 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Appendix A Figure A1: Top View showing ID and Date Code P a g e 24 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Appendix B Radiation Bias Connection Tables PIN 1 2 Table B1: Biased Conditions FUNCTION INPUT ADJUST 3 CASE PIN 1 2 3 OUTPUT Table B2: All GND’d FUNCTION INPUT ADJUST OUTPUT CONNECTION / BIAS + 15V -15V To Pin 3 via 150Ω resistor To pin 2 via 150Ω resistor to - 15V CONNECTION / BIAS Ground Ground Ground P a g e 25 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Figure B1: Total Dose Bias Circuit Figure B2: Pin-Out P a g e 26 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Figure B3: Bias Board (top view) Figure B4: Bias Board (bottom view) P a g e 27 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Appendix C P a g e 28 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 P a g e 29 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 P a g e 30 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Appendix D Table D1: Pre-Irradiation Electrical Characteristics of Device-Under-Test P a g e 31 | 32 LINEAR TECHNOLOGY CORPORATION TID LDR RH1086MH W1231270.1 W4 Table D2: Post-Irradiation Electrical Characteristics of Device-Under-Test P a g e 32 | 32 LINEAR TECHNOLOGY CORPORATION