ELDRS_LDR_RH1086MH_W1231270.1_W4.pdf

TID LDR RH1086MH W1231270.1 W4
Total Ionization Dose (TID) Test Results of the
RH1086MH 0.5A Low Dropout Positive Adjustable
Regulator @ Low Dose Rate (LDR)
LDR = 10 mrads(Si)/s
20 November 2014
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the Product Engineering and Design S-Power groups
from Linear Technology for their help with the board design and assembly as well as the
data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd
from Defense Microelectronics Activity (DMEA) for the extensive work for board setup
and continuous dosimetry monitoring throughout the ELDRS tests.
P a g e 1 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
TID LDR Testing of the RH1086MH 0.5A Low Dropout
Positive Adjustable Regulator
Part Type Tested: RH1086MH 0.5A Low Dropout Positive Adjustable Regulator
Traceability Information: Fab Lot # W1231270.1; Assembly Lot # 719601.1; Wafer # 4; Date
Code 1328A. See photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units
for unbiased irradiation. Serial numbers 667-671 had all pins tied to ground during irradiation.
Serial numbers 662-666 were biased during irradiation. Serial numbers 660 and 661 were used
as control. See Appendix B for the radiation bias connection tables.
Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test
increments: 10 Krads(Si), 20 Krads(Si), 50 Krads(Si), 73 Krads(Si), 107 Krads(Si).
Radiation dose: 10 mrads(Si)/sec.
Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D.
Test Hardware and Software: LTX pre- and post-irradiation test program EFCR1086H.02.
Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883
and MIL-STD-750.
SUMMARY
ALL 12 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED
IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT.
ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST.
P a g e 2 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
1.0
Overview and Background
Among other radiation effects, Total Ionizing Dose (TID) may affect electrical characteristics,
causing parametric and/or functional failures in integrated circuits. During gamma-irradiations,
TID-induced and transported electron-hole pairs may result in charge trapping in a transistor’s
dielectrics and interface regions, affecting the device’s basic features. Such effects warrant testing
and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE)
may take place, depending on the circuit’s design and process technology. Hence the requirement
per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in
TM1019, MIL-STD-883 is to not exceed the allowed time from the end of an incremented
irradiation and an electrical test to more than one hour. Additionally, the total time from the end of
one incremental irradiation to the start of the next incremental step should be less than two hours.
2.0
Radiation Facility and Test Equipment
The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento,
California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10
mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions
the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate
verified by ion chamber detectors. See Appendix C for the certificate of dosimetry.
3.0
Test Conditions
The 10 samples were placed in a lead/aluminum container and aligned with the radiation source,
Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at
+/- 15V and other five had all pads grounded. The devices were irradiated up to 107 Krad(Si) with
increments of 10, 20, 50, 73 Krads(Si). After each irradiation, the samples were transported in dry
ice to Linear Technology testing facility. Testing was performed on the two control units to confirm
the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2
control).
The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must
pass the datasheet limits. If any of the tested parameters of these five units do not meet the
required limits then a failure-analysis of the part should be conducted and if valid the lot will be
scrapped.
P a g e 3 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations:
-
VREF (V) @ 10mA ≤ IOUT ≤ IFULL LOAD, 1.5V ≤ (VIN – VOUT) ≤ 15V
Line Regulation (%) @ ILOAD = 10mA, 1.5V ≤ (VIN – VOUT) ≤ 15V
Load Regulation (%) @ (VIN – VOUT) = 3V, 10mA ≤ IOUT ≤ IFULL LOAD
Dropout Voltage (V) @ IOUT = 0.5A, VREF = 1%
Current Limit (A) @ (VIN – VOUT) = 5V
Current Limit (A) @ (VIN – VOUT) = 25V
Minimum Load Current (mA) @ (VIN – VOUT) = 25V
Adjust Pin Current (uA)
Delta Adjust Current (uA) @ 10mA ≤ IOUT ≤ IFULL LOAD, 1.5V ≤ (VIN – VOUT) ≤ 15V
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
P a g e 4 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
5.0
Test Results
All ten samples passed the post-irradiation electrical tests. All measurements of the nine listed
parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can be
calculated as follows:
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
Where +KTL is the upper tolerance limit and -KTL is the lower tolerance limit.
These tolerance limits are defined in a table of inverse normal probability distribution.
However, in most cases, mean and standard deviations are unknown and therefore it is practical
to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample
size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size
of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor
in this report is 2.742.
In the plots, the dotted lines with diamond markers are the average of the measured data points
of five samples irradiated under electrical bias while the dashed lines with X-markers are the
average of measured data points of five units irradiated with all pins tied to ground. The solid lines
with triangle markers are the average of the data points after the calculation of the K TL statistics
on the sample irradiated in the biased setup. The solid lines with square symbols are the average
of the measured points after the application of the KTL statistics on the five samples irradiated with
all pins grounded. The orange solid lines with circle markers are the specification limits.
The 107 Krads(Si) test limits are using Linear Technology datasheet 100 Krads(Si) specification
limits.
P a g e 5 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
VREF (V) @ 10mA≤ IOUT ≤ IFULL LOAD; 1.5V≤ VIN - VOUT ≤ 15V
1.280
Specification MAX
1.270
Ps90%/90% (+KTL) Biased
1.260
Ps90%/90% (+KTL) All GND'd
1.250
Average All GND'd
1.240
Ps90%/90% (-KTL) All GND'd
1.230
Average Biased
1.220
Ps90%/90% (-KTL) Biased
1.210
Specification MIN
1.200
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.1 Plot of Reference Voltage versus Total Dose
The measured data of 10 samples are within datasheet specification limits. Note the 107 Krads(Si)
computed +KTL biased data point is slightly lower than the maximum limit due to the small 5piece sample size.
P a g e 6 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.1: Raw data for reference voltage at full load versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL) under the orange headers)
Parameter
Units
667
668
669
670
671
662
663
664
665
666
660
661
Vref @ 10mA≤ IOUT ≤ IFULL LOAD;
1.5V≤ VIN - VOUT ≤ 15V
(V)
0
All GND'd Irradiation
1.25124
All GND'd Irradiation
1.25552
All GND'd Irradiation
1.25060
All GND'd Irradiation
1.24655
All GND'd Irradiation
1.25296
Biased Irradiation
1.25491
Biased Irradiation
1.25593
Biased Irradiation
1.25135
Biased Irradiation
1.25220
Biased Irradiation
1.25342
Control Unit
1.25617
Control Unit
1.25674
All GND'd Irradiation Statistics
Average All GND'd
1.25138
Std Dev All GND'd
0.00330
Ps90%/90% (+KTL) All GND'd
1.26042
Ps90%/90% (-KTL) All GND'd
1.24233
Biased Irradiation Statistics
Average Biased
1.25356
Std Dev Biased
0.00188
Ps90%/90% (+KTL) Biased
1.25872
Ps90%/90% (-KTL) Biased
1.24840
Specification MIN
1.225
Status (Measurements) All GND'd PASS
Status (Measurements) Biased
PASS
Specification MAX
1.270
Status (Measurements) All GND'd PASS
Status (Measurements) Biased
PASS
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
10
1.25185
1.25352
1.25484
1.25422
1.25215
1.25207
1.25093
1.24981
1.25169
1.25387
1.25474
1.25185
20
1.25142
1.25302
1.25440
1.25383
1.25180
1.24983
1.24864
1.24753
1.24952
1.25170
1.25461
1.25645
50
1.25067
1.25195
1.25325
1.25287
1.25051
1.24366
1.24210
1.24115
1.24282
1.24599
1.25409
1.25658
73
1.24991
1.25111
1.25227
1.25196
1.24935
1.23909
1.23696
1.23600
1.23754
1.24150
1.25386
1.25600
107
1.24922
1.25028
1.25144
1.25129
1.24777
1.25415
1.23045
1.22988
1.23102
1.23558
1.25402
1.25644
1.25331
0.00129
1.25686
1.24977
1.25290
0.00128
1.25640
1.24939
1.25185
0.00124
1.25526
1.24844
1.25092
0.00127
1.25439
1.24744
1.25000
0.00153
1.25420
1.24581
1.25168
0.00150
1.25579
1.24756
1.220
PASS
PASS
1.275
PASS
PASS
1.24944
0.00154
1.25368
1.24521
1.219
PASS
PASS
1.275
PASS
PASS
1.24314
0.00184
1.24818
1.23810
1.215
PASS
PASS
1.275
PASS
PASS
1.23822
0.00215
1.24411
1.23233
1.23621
0.01027
1.26439
1.20804
1.210
PASS
PASS
1.275
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
FAIL
PASS
P a g e 7 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Line Regulation (%) @ IOUT=10mA; 1.5V≤ VIN-VOUT ≤15V
0.30
Specification MAX
0.25
Ps90%/90% (+KTL) Biased
0.20
Average Biased
0.15
Ps90%/90% (+KTL) All GND'd
0.10
Average All GND'd
0.05
Ps90%/90% (-KTL) All GND'd
0.00
Ps90%/90% (-KTL) Biased
-0.05
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.2: Plot of Line Regulation versus Total Dose
P a g e 8 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.2: Raw data for line regulation versus total dose including the statistical calculations,
maximum specification, and the status of the test (PASS/FAIL under the second orange header)
Parameter Line Reg @ IOUT =10mA; 1.5V VIN-VOUT 15V
Units
(%)
0
667
All GND'd Irradiation
0.00533
668
All GND'd Irradiation
0.00076
669
All GND'd Irradiation
0.00404
670
All GND'd Irradiation
0.00918
671
All GND'd Irradiation
0.00533
662
Biased Irradiation
0.01139
663
Biased Irradiation
0.00683
664
Biased Irradiation
0.00129
665
Biased Irradiation
0.00685
666
Biased Irradiation
0.00616
660
Control Unit
0.01291
661
Control Unit
0.00531
All GND'd Irradiation Statistics
Average All GND'd
0.00493
Std Dev All GND'd
0.00302
Ps90%/90% (+KTL) All GND'd
0.01322
Ps90%/90% (-KTL) All GND'd
-0.00336
Biased Irradiation Statistics
Average Biased
0.00651
Std Dev Biased
0.00358
Ps90%/90% (+KTL) Biased
0.01633
Ps90%/90% (-KTL) Biased
-0.00332
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
0.20
Status (Measurements) All GND'd
PASS
Status (Measurements) Biased
PASS
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
10
0.00533
0.01225
0.00912
0.00532
0.00076
0.00305
0.00770
0.00763
0.01150
0.00844
0.00000
0.00914
20
0.00686
0.00685
0.00601
0.01293
0.00838
0.01076
0.00924
0.01452
0.01297
0.01143
0.00608
0.00531
50
0.01677
0.00990
0.00685
0.00533
0.01449
0.02461
0.02465
0.02390
0.02693
0.01998
0.01749
0.00228
73
0.01678
0.01372
0.01827
0.01066
0.02068
0.03925
0.02929
0.04552
0.03160
0.03610
0.00837
0.00911
107
0.02373
0.03035
0.02133
0.02423
0.02147
0.01217
0.04658
0.06196
0.05803
0.04932
0.00836
0.01017
0.00656
0.00435
0.01847
-0.00536
0.00820
0.00278
0.01582
0.00059
0.01067
0.00489
0.02407
-0.00274
0.01602
0.00392
0.02676
0.00528
0.02422
0.00366
0.03427
0.01417
0.00766
0.00303
0.01597
-0.00064
0.01178
0.00203
0.01736
0.00621
0.02401
0.00253
0.03095
0.01707
0.03635
0.00642
0.05396
0.01874
0.04561
0.01972
0.09967
-0.00845
0.20
PASS
PASS
0.21
PASS
PASS
0.23
PASS
PASS
0.25
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 9 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Load Regulation (%) @ 10mA≤ IOUT ≤ IFULL LOAD ;VIN-VOUT=3V
0.40
Specification MAX
0.30
Ps90%/90% (+KTL) Biased
0.20
Ps90%/90% (+KTL) All GND'd
Average Biased
0.10
Average All GND'd
Ps90%/90% (-KTL) All GND'd
0.00
Ps90%/90% (-KTL) Biased
-0.10
-0.20
-0.30
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.3: Plot of Load Regulation versus Total Dose
P a g e 10 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.3: Raw data for load regulation versus total dose including the statistical calculations,
maximum specification, and the status of the test (PASS/FAIL).
Parameter
Units
667
668
669
670
671
662
663
664
665
666
660
661
Load Reg @ 10mA≤ IOUT ≤ IFULL LOAD,
VIN-VOUT =3V
(%)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
0
-0.10728
-0.11767
-0.10048
-0.00092
-0.03196
-0.07579
-0.05237
-0.12704
-0.10111
0.01689
0.00008
-0.02360
10
-0.00564
-0.01065
-0.00152
-0.00182
-0.00533
-0.01615
-0.00541
-0.01305
-0.00769
-0.00768
-0.01072
-0.00564
20
-0.01135
-0.01294
-0.01368
-0.00837
-0.00762
-0.01061
-0.01153
-0.00688
-0.00153
-0.00609
-0.01285
-0.00531
50
-0.00839
-0.01066
-0.00989
-0.00830
-0.01380
-0.02078
-0.01082
-0.02151
-0.01696
-0.02372
-0.00304
-0.01214
73
-0.02136
-0.02591
-0.01447
-0.01523
-0.01984
-0.02616
-0.01310
-0.02083
-0.01002
-0.01690
-0.00844
-0.01139
107
-0.02122
-0.02371
-0.02971
-0.01836
-0.02605
-0.00608
-0.02410
-0.01783
-0.01448
-0.02454
-0.00608
-0.01708
-0.07166
0.05195
0.07080
-0.21412
-0.00499
0.00370
0.00514
-0.01513
-0.01079
0.00270
-0.00338
-0.01821
-0.01021
0.00225
-0.00405
-0.01637
-0.01936
0.00469
-0.00649
-0.03223
-0.02381
0.00437
-0.01184
-0.03578
-0.06788
0.05499
0.08289
-0.21866
-0.01000
0.00444
0.00217
-0.02217
-0.00733
0.00399
0.00362
-0.01828
-0.01876
0.00506
-0.00488
-0.03264
-0.01740
0.00636
0.00003
-0.03484
-0.01741
0.00763
0.00350
-0.03831
0.3
PASS
PASS
0.3
PASS
PASS
0.3
PASS
PASS
0.3
PASS
PASS
0.3
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 11 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
1.30
Specification MAX
Dropout Voltage (V) @ IOUT = 0.5A
1.25
Ps90%/90% (+KTL) All GND'd
1.20
1.15
Ps90%/90% (+KTL) Biased
1.10
Average Biased
1.05
Average All GND'd
1.00
0.95
Ps90%/90% (-KTL) Biased
0.90
Ps90%/90% (-KTL) All GND'd
0.85
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.4: Plot of Dropout Voltage versus Total Dose
P a g e 12 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.4: Raw data for dropout voltage versus total dose including the statistical calculations,
maximum specification, and the status of the test (PASS/FAIL).
Parameter
Units
667
668
669
670
671
662
663
664
665
666
660
661
Dropout Voltage @ IOUT = 0.5A
(V)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
0
0.95429
0.96995
0.96002
0.97070
0.95784
0.96438
0.96148
0.96517
0.95503
0.95735
0.96246
0.96399
10
0.94160
0.94842
0.94865
0.94659
0.94339
0.93989
0.94958
0.94431
0.96401
0.95912
0.92021
0.95474
20
0.94231
0.94895
0.94765
0.94418
0.94255
0.94948
0.95286
0.94582
0.95510
0.96020
0.92577
0.93904
50
0.94365
0.95059
0.95033
0.94578
0.94222
0.95632
0.95434
0.94465
0.96067
0.96312
0.93924
0.93908
73
0.94524
0.95245
0.95276
0.94833
0.94650
0.95795
0.95654
0.95128
0.96194
0.96485
0.94273
0.93731
107
0.94335
0.95869
0.91632
0.95290
0.90158
0.93707
0.96606
0.95968
0.97113
0.97281
0.93831
0.93276
0.96256
0.00738
0.98280
0.94232
0.94573
0.00312
0.95429
0.93716
0.94513
0.00302
0.95341
0.93684
0.94651
0.00382
0.95698
0.93605
0.94906
0.00342
0.95844
0.93968
0.93457
0.02458
1.00196
0.86718
0.96068
0.00440
0.97275
0.94861
0.95138
0.01006
0.97895
0.92381
0.95269
0.00547
0.96770
0.93769
0.95582
0.00714
0.97540
0.93624
0.95851
0.00521
0.97279
0.94423
0.96135
0.01450
1.00112
0.92158
1.25
PASS
PASS
1.25
PASS
PASS
1.26
PASS
PASS
1.27
PASS
PASS
1.29
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 13 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Current Limit (A) @ VIN - VOUT = 5V
1.20
1.10
Ps90%/90% (+KTL) All GND'd
1.00
Ps90%/90% (+KTL) Biased
0.90
Average All GND'd
0.80
Average Biased
0.70
Ps90%/90% (-KTL) Biased
0.60
Ps90%/90% (-KTL) All GND'd
0.50
Specification MIN
0.40
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.5: Plot of Current Limit versus Total Dose
P a g e 14 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.5: Raw data for current limit versus total dose including the statistical calculations,
minimum specification, and the status of the test (PASS/FAIL)
Parameter
Units
667
668
669
670
671
662
663
664
665
666
660
661
Current Limit (A) @ VIN - VOUT = 5V
(A)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
0
0.90094
0.88998
0.91463
0.89800
0.90634
0.89635
0.89857
0.76807
0.90205
0.76528
0.75971
0.89711
10
0.90733
0.90337
0.75427
0.76303
0.90438
0.76702
0.77043
0.76628
0.76729
0.90774
0.88028
0.77171
20
0.90406
0.90065
0.75119
0.75867
0.90065
0.76764
0.76852
0.76593
0.76135
0.90594
0.87549
0.89779
50
0.89946
0.89646
0.74592
0.75274
0.89571
0.76347
0.76280
0.75642
0.75795
0.90340
0.86815
0.88597
73
0.91953
0.91638
0.76637
0.77222
0.91649
0.78303
0.78201
0.77681
0.77703
0.92379
0.88825
0.90136
107
0.92311
0.92448
0.76301
0.77847
0.91201
0.88726
0.78774
0.78184
0.78209
0.92892
0.88786
0.90272
0.90198
0.00922
0.92725
0.87670
0.84648
0.08025
1.06651
0.62644
0.84304
0.08049
1.06375
0.62233
0.83805
0.08104
1.06028
0.61583
0.85820
0.08119
1.08083
0.63557
0.86022
0.08200
1.08507
0.63536
0.84606
0.07251
1.04487
0.64725
0.5
PASS
PASS
0.79575
0.06263
0.96747
0.62403
0.5
PASS
PASS
0.79388
0.06271
0.96582
0.62193
0.5
PASS
PASS
0.78881
0.06413
0.96466
0.61296
0.5
PASS
PASS
0.80853
0.06449
0.98537
0.63170
0.83357
0.06964
1.02453
0.64261
0.5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 15 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Current Limit (A) @ VIN - VOUT = 25V
0.095
Ps90%/90% (+KTL) All GND'd
0.085
0.075
Average Biased
0.065
Ps90%/90% (+KTL) Biased
0.055
Ps90%/90% (-KTL) Biased
0.045
Average All GND'd
0.035
Ps90%/90% (-KTL) All GND'd
0.025
Specification MIN
0.015
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.6: Plot of Current Limit @ 25V versus Total Dose
P a g e 16 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.6: Raw data for current limit versus total dose including the statistical calculations,
minimum specification, and the status of the test (PASS/FAIL)
Parameter Current Limit (A) @ VIN - VOUT = 25V
Units
(A)
667
All GND'd Irradiation
668
All GND'd Irradiation
669
All GND'd Irradiation
670
All GND'd Irradiation
671
All GND'd Irradiation
662
Biased Irradiation
663
Biased Irradiation
664
Biased Irradiation
665
Biased Irradiation
666
Biased Irradiation
660
Control Unit
661
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
0
0.07617
0.07455
0.07628
0.07457
0.07569
0.07475
0.07453
0.07611
0.07628
0.07518
0.07456
0.07399
10
0.07663
0.07562
0.07571
0.07594
0.07665
0.07299
0.07714
0.07636
0.07801
0.07462
0.06957
0.07667
20
0.07331
0.07205
0.07185
0.07190
0.07263
0.07155
0.07428
0.07348
0.07218
0.07042
0.06771
0.07145
50
0.05801
0.05729
0.05681
0.05702
0.05729
0.05782
0.05873
0.05665
0.05713
0.05636
0.05672
0.05663
73
0.07247
0.07134
0.07193
0.07191
0.07234
0.07198
0.07371
0.07158
0.07167
0.07063
0.07300
0.07126
107
0.07362
0.07458
0.06379
0.07463
0.06285
0.07318
0.07653
0.07565
0.07503
0.07350
0.07381
0.07264
0.07545
0.00084
0.07777
0.07314
0.07611
0.00050
0.07748
0.07475
0.07235
0.00062
0.07405
0.07065
0.05728
0.00045
0.05852
0.05604
0.07200
0.00044
0.07321
0.07079
0.06989
0.00602
0.08641
0.05338
0.07537
0.00079
0.07754
0.07320
0.02
PASS
PASS
0.07582
0.00202
0.08135
0.07029
0.02
PASS
PASS
0.07238
0.00153
0.07659
0.06818
0.019
PASS
PASS
0.05734
0.00096
0.05996
0.05472
0.019
PASS
PASS
0.07191
0.00112
0.07499
0.06883
0.07478
0.00142
0.07868
0.07088
0.018
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 17 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Minimum Load Current @ VIN - VOUT = 25V
11.00
Specification MAX
10.00
9.00
Ps90%/90% (+KTL) All GND'd
8.00
Average All GND'd
7.00
Ps90%/90% (+KTL) Biased
6.00
Average Biased
5.00
4.00
Ps90%/90% (-KTL) All GND'd
3.00
Ps90%/90% (-KTL) Biased
2.00
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.7: Plot of Minimum Load Current versus Total Dose
The average measured values of 10 samples pass the datasheet specification maximum limit.
P a g e 18 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.7: Raw data table for minimum load current versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter Minimum Load Current @ VIN - VOUT = 25V
Units
(mA)
667
All GND'd Irradiation
668
All GND'd Irradiation
669
All GND'd Irradiation
670
All GND'd Irradiation
671
All GND'd Irradiation
662
Biased Irradiation
663
Biased Irradiation
664
Biased Irradiation
665
Biased Irradiation
666
Biased Irradiation
660
Control Unit
661
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
0
2.82694
2.81329
2.85721
2.79644
2.81352
2.78401
2.77815
2.81543
2.84959
2.77884
2.78371
2.78890
10
2.83624
2.80123
2.80508
2.82557
2.82404
2.82680
2.87314
2.81598
2.78265
2.76954
2.91422
2.78934
20
2.82941
2.79928
2.80569
2.83201
2.82094
2.80943
2.86000
2.81004
2.80996
2.76175
2.90089
2.86915
50
2.84471
2.80581
2.80581
2.83310
2.83921
2.80688
2.87863
2.81809
2.80124
2.77005
2.86375
2.86666
73
2.84865
2.81266
2.81571
2.83707
2.83836
2.80420
2.87862
2.82174
2.81884
2.78133
2.86429
2.87115
107
2.86407
2.81375
2.91134
2.84881
2.94824
2.87748
2.88244
2.82374
2.82007
2.78340
2.87437
2.89083
2.82148
0.02272
2.88376
2.75920
2.81843
0.01478
2.85896
2.77791
2.81747
0.01445
2.85710
2.77783
2.82572
0.01864
2.87684
2.77461
2.83049
0.01558
2.87322
2.78777
2.87724
0.05295
3.02244
2.73205
2.80120
0.03111
2.88650
2.71590
2.81362
0.04069
2.92520
2.70204
2.81023
0.03474
2.90549
2.71498
2.81498
0.03979
2.92409
2.70586
2.82094
0.03599
2.91964
2.72225
2.83743
0.04195
2.95244
2.72241
10
PASS
PASS
10
PASS
PASS
10
PASS
PASS
10
PASS
PASS
10
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 19 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Adjust Pin Current (uA)
130.00
120.00
Specification MAX
110.00
Ps90%/90% (+KTL) All GND'd
100.00
Ps90%/90% (+KTL) Biased
90.00
80.00
Average All GND'd
70.00
Average Biased
60.00
Ps90%/90% (-KTL) Biased
50.00
Ps90%/90% (-KTL) All GND'd
40.00
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.8: Plot of Adjust Pin Current versus Total Dose
P a g e 20 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.8: Raw data table for adjust pin current versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter
Units
667
668
669
670
671
662
663
664
665
666
660
661
Adjust Pin Current
(uA)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
0
51.46739
51.54274
52.17214
51.53872
51.26912
50.51411
50.75986
51.45809
52.05428
50.22866
50.69638
50.86432
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
10
20
50
73
51.16077 51.13360 51.35074 51.49332
50.68806 50.64878 50.89056 51.09520
50.89416 51.09883 51.21584 51.10828
51.16346 51.47364 51.77897 51.59667
51.80642 51.95401 52.38297 52.07212
51.81381 50.50613 49.85899 49.70883
51.66335 51.31272 51.14656 51.04864
50.47853 50.27752 50.80077 49.93206
49.61465 50.52639 50.07566 49.97163
49.83895 49.84284 49.55891 49.47996
55.99811 54.86282 52.67405 52.26501
49.90421 53.07209 53.18373 53.24805
107
52.10466
50.56190
58.76696
51.42087
61.01048
52.93249
50.00793
49.09832
49.01781
48.61651
52.76613
53.96946
51.59802 51.14257 51.26177 51.52382 51.47312 54.77297
0.33964 0.42123 0.48549 0.57643 0.40324 4.76833
52.52932 52.29760 52.59300 53.10438 52.57880 67.84775
50.66672 49.98755 49.93055 49.94326 50.36744 41.69820
51.00300 50.68186 50.49312 50.28818 50.02822 49.93461
0.74331 1.01679 0.53441 0.66347 0.60339 1.75142
53.04115 53.46988 51.95847 52.10741 51.68271 54.73702
48.96485 47.89383 49.02777 48.46894 48.37374 45.13221
120
PASS
PASS
120
PASS
PASS
120
PASS
PASS
120
PASS
PASS
120
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 21 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Adjust Pin Current Change (uA) @ 10mA ≤ IOUT ≤ IFULL LOAD ;
1.5V ≤ VIN - VOUT ≤ 15V
6
Specification MAX
5
Ps90%/90% (+KTL) All GND'd
4
Ps90%/90% (+KTL) Biased
3
Average All GND'd
2
Average Biased
Ps90%/90% (-KTL) All GND'd
1
Ps90%/90% (-KTL) Biased
0
0
20
40
60
80
100
120
Total Dose (Krads(Si))
Figure 5.9: Plot of Adjust Pin Current Change versus Total Dose
P a g e 22 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table 5.9: Raw data table for adjust pin current change versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter
Units
667
668
669
670
671
662
663
664
665
666
660
661
Adj Pin I Change @ 10mA≤IOUT ≤IFULL LOAD;
Total Dose (Krads(Si)) @ 10 mrads(Si)/s
1.5V≤VIN-VOUT ≤15V
(uA)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
0
0.48135
0.41860
0.35140
0.38688
0.37788
0.43090
0.41442
0.40064
0.39054
0.41349
0.39923
0.44066
10
0.34583
0.38151
0.35920
0.39203
0.32857
0.39632
0.33062
0.39657
0.28453
0.35550
0.44516
0.33420
20
0.42368
0.40238
0.31177
0.35283
0.32147
0.40865
0.35594
0.43047
0.32294
0.45191
0.41310
0.42321
50
0.28232
0.49347
0.40681
0.49311
0.48036
0.41517
0.28197
0.44817
0.42327
0.44575
0.44669
0.37922
73
0.38013
0.37982
0.34519
0.41106
0.35751
0.36377
0.33462
0.42177
0.32362
0.37478
0.34369
0.38192
107
0.42720
0.37144
0.33960
0.37104
0.29150
0.40536
0.31876
0.38200
0.38609
0.41783
0.43880
0.42305
0.40322
0.04984
0.53988
0.26657
0.36143
0.02583
0.43224
0.29061
0.36242
0.04920
0.49734
0.22751
0.43121
0.09067
0.67984
0.18259
0.37474
0.02522
0.44390
0.30559
0.36016
0.04969
0.49641
0.22391
0.41000
0.01528
0.45191
0.36809
0.35271
0.04735
0.48255
0.22287
0.39398
0.05338
0.54035
0.24762
0.40287
0.06906
0.59222
0.21352
0.36371
0.03856
0.46944
0.25798
0.38201
0.03823
0.48683
0.27719
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
P a g e 23 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Appendix A
Figure A1: Top View showing ID and Date Code
P a g e 24 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Appendix B
Radiation Bias Connection Tables
PIN
1
2
Table B1: Biased Conditions
FUNCTION
INPUT
ADJUST
3
CASE
PIN
1
2
3
OUTPUT
Table B2: All GND’d
FUNCTION
INPUT
ADJUST
OUTPUT
CONNECTION / BIAS
+ 15V
-15V
To Pin 3 via 150Ω resistor
To pin 2 via 150Ω resistor to
- 15V
CONNECTION / BIAS
Ground
Ground
Ground
P a g e 25 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Figure B1: Total Dose Bias Circuit
Figure B2: Pin-Out
P a g e 26 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Figure B3: Bias Board (top view)
Figure B4: Bias Board (bottom view)
P a g e 27 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Appendix C
P a g e 28 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
P a g e 29 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
P a g e 30 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Appendix D
Table D1: Pre-Irradiation Electrical Characteristics of Device-Under-Test
P a g e 31 | 32
LINEAR TECHNOLOGY CORPORATION
TID LDR RH1086MH W1231270.1 W4
Table D2: Post-Irradiation Electrical Characteristics of Device-Under-Test
P a g e 32 | 32
LINEAR TECHNOLOGY CORPORATION
Similar pages