ELDRS_LDR_RH117H_Fab_Lot_W10905063_1_W10.pdf

TID LDR RH117H W10905063.1 W10
Total Ionization Dose (TID) Test Results of the RH117H
Positive Adjustable Regulator @ Low Dose Rate (LDR)
LDR = 10 mrads(Si)/s
18 December 2014
Duc Nguyen, Sana Rezgui
Acknowledgements
The authors would like to thank the Product Engineering and Design S-Power groups
from Linear Technology for their help with the board design and assembly as well as the
data collection pre- and post-irradiations. Special thanks are also for Thomas Shepherd
from Defense Microelectronics Activity (DMEA) for the extensive work for board setup
and continuous dosimetry monitoring throughout the ELDRS tests.
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LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
TID LDR Testing of the RH117H Positive Adjustable
Regulator
Part Type Tested: RH117H Positive Adjustable Regulator
Traceability Information: Fab Lot # W10905063.1; Assembly Lot # 755614; Wafer # 10. See
photograph of unit under test in Appendix A.
Quantity of Units: 12 units received, 2 units for control, 5 units for biased irradiation, and 5 units
for unbiased irradiation. Serial numbers 770-774 had all pins tied to ground during irradiation.
Serial numbers 765-769 were biased during irradiation. Serial numbers 723 and 724 were used
as control. See Appendix B for the radiation bias connection tables.
Radiation and Electrical Test Increments: Ionizing radiation with the following electrical test
increments: 11 Krads(Si), 22 Krads(Si), 31 Krads(Si), 50 Krads(Si).
Radiation dose: 10 mrads(Si)/sec.
Radiation Test Standard: MIL-STD-883 TM1019.9 Condition D.
Test Hardware and Software: LTX pre- and post-irradiation test program EQ2CR117H.01.
Facility and Radiation Source: Defense Micro Electronic Activity (DMEA) and Cobalt-60.
Irradiation and Test Temperature: Room temperature controlled to 24°C±6°C per MIL-STD-883
and MIL-STD-750.
SUMMARY
ALL 12 PARTS PASSED THE ELECTRICAL TEST LIMITS AS SPECIFIED
IN THE DATASHEET AFTER EACH IRRADIATION INCREMENT.
ADDITIONAL INFORMATION CAN BE PROVIDED PER REQUEST.
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TID LDR RH117H W10905063.1 W10
1.0
Overview and Background
Among other radiation effects, Total Ionizing Dose (TID) may affect electrical characteristics,
causing parametric and/or functional failures in integrated circuits. During gamma-irradiations,
TID-induced and transported electron-hole pairs may result in charge trapping in a transistor’s
dielectrics and interface regions, affecting the device’s basic features. Such effects warrant testing
and monitoring of circuits to TID, after which annealing and/or Time Dependent Effects (TDE)
may take place, depending on the circuit’s design and process technology. Hence the requirement
per Condition D (for low-dose rates ranging from less than or equal to 10 mrads(Si)/sec) in
TM1019, MIL-STD-883 is to not exceed the allowed time of one hour from the end of an
incremented irradiation and an electrical test. Additionally, the total time from the end of one
incremental irradiation to the start of the next incremental step should be less than two hours.
2.0
Radiation Facility and Test Equipment
The samples were irradiated at Defense Micro-Electronics Activity (DMEA) facility in Sacramento,
California. DMEA utilizes J.L. Shepherd model 81-22/484 to provide the dose-rate of 10
mrads(Si)/s. A special design screw-driven automatic cart inside the exposure tunnel positions
the Device-Under-Test (DUT) precisely and repeatedly from the source to attain optimal rate
verified by ion chamber detectors. See Appendix C for the certificate of dosimetry.
3.0
Test Conditions
The 10 samples were placed in a lead/aluminum container and aligned with the radiation source,
Cobalt-60, at DMEA facility in Sacramento, California. During irradiation, five units were biased at
+/- 15V and other five had all pads grounded. The devices were irradiated up to 50 Krad(Si) with
increments of 10, 22, 31 Krads(Si). After each irradiation, the samples were transported in dry ice
to Linear Technology testing facility. Testing was performed on the two control units to confirm
the operation of the test system prior to the electrical testing of the 12 units (10 irradiated and 2
control).
The criteria to pass the low dose-rate test is that five samples irradiated under electrical bias must
pass the datasheet limits. If any of the tested parameters of these five units do not meet the
required limits then a failure-analysis of the part should be conducted and if valid the lot will be
scrapped.
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TID LDR RH117H W10905063.1 W10
4.0
Tested Parameters
The following parameters were measured pre- and post-irradiations:
-
VREF (V) @ 10mA ≤ IOUT ≤ IMAX, 3V ≤ (VIN – VOUT) ≤ 40V
Line Regulation (%/V) @ ILOAD = 10mA, 3V ≤ (VIN – VOUT) ≤ 40V
Load Regulation (mV) @ VOUT ≤ 5V, 10mA ≤ IOUT ≤ IMAX
Load Regulation (%) @ VOUT ≥ 5V, 10mA ≤ IOUT ≤ IMAX
Adjust Pin Current (uA)
Adjust Pin Current Change (uA) @ 10mA ≤ IOUT ≤ IMAX
Adjust Pin Current Change (uA) @ 3V ≤ (VIN – VOUT) ≤ 40V
Minimum Load Current (mA) @ (VIN – VOUT) = 40V
Current Limit (A) @ (VIN – VOUT) ≤ 5V
Current Limit (A) @ (VIN – VOUT) = 40V
Appendix D details the test conditions, minimum and maximum values at different accumulated
doses.
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TID LDR RH117H W10905063.1 W10
5.0
Test Results
All ten samples passed the post-irradiation electrical tests. All measurements of the ten listed
parameters in section 4.0 are within the specification limits.
The used statistics in this report are based on the tolerance limits, which are bounds to gage the
quality of the manufactured products. It assumes that if the quality of the items is normally
distributed with known mean and known standard deviation, the two-sided tolerance limits can be
calculated as follows:
+KTL = mean + (KTL) (standard deviation)
-KTL = mean - (KTL) (standard deviation)
Where +KTL is the upper tolerance limit and -KTL is the lower tolerance limit.
These tolerance limits are defined in a table of inverse normal probability distribution.
However, in most cases, mean and standard deviations are unknown and therefore it is practical
to estimate both of them from a sample. Hence the tolerance limit depends greatly on the sample
size. The Ps90%/90% KTL factor for a lot quality P of 0.9, confidence C of 0.9 with a sample size
of 5, can be found from the tabulated table (MIL-HDBK-814, page 94, table IX-B). The KTL factor
in this report is 2.742.
In the plots, the dotted lines with diamond markers are the average of the measured data points
of five samples irradiated under electrical bias while the dashed lines with X-markers are the
average of measured data points of five units irradiated with all pins tied to ground. The solid lines
with triangle markers are the 90%/90% minimum and maximum determined from the calculation
of the KTL on the samples irradiated in the biased setup. The solid lines with square symbols are
the 90%/90% minimum and maximum determined from the calculation of the KTL on the five
samples irradiated with all pins grounded. The orange solid lines with circle markers are the
specification limits.
The 11 Krads(Si) test limits are taken from the Linear Technology datasheet’s 10 Krads(Si)
specification limits. The 22 Krads(Si) test limits are taken from the Linear Technology datasheet’s
20 Krads(Si) specification limits.
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TID LDR RH117H W10905063.1 W10
VREF (V) @ 3V≤ VIN - VOUT ≤40V, 10mA≤ IL ≤ 0.5A
1.32
1.30
Specification MAX
Ps90%/90% (+KTL) Biased
1.28
Ps90%/90% (+KTL) All GND'd
1.26
Average All GND'd
Ps90%/90% (-KTL) All GND'd
1.24
Average Biased
1.22
Ps90%/90% (-KTL) Biased
Specification MIN
1.20
1.18
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.1 Plot of Reference Voltage versus Total Dose
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TID LDR RH117H W10905063.1 W10
Table 5.1: Raw data for reference voltage at full load versus total dose including the statistical
calculations, minimum specification, maximum specification, and the status of the test
(PASS/FAIL) under the orange headers)
Parameter VREF @ 3V≤VI-VO≤40V,10mA≤IL≤0.5A
Units
(V)
770
All GND'd Irradiation
771
All GND'd Irradiation
772
All GND'd Irradiation
773
All GND'd Irradiation
774
All GND'd Irradiation
765
Biased Irradiation
766
Biased Irradiation
767
Biased Irradiation
768
Biased Irradiation
769
Biased Irradiation
723
Control Unit
724
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
1.24362
1.24113
1.24475
1.24414
1.24348
1.24666
1.24505
1.24316
1.24479
1.24916
1.25226
1.24825
11
1.24211
1.24065
1.24463
1.24379
1.24249
1.24440
1.24220
1.24004
1.24149
1.24776
1.25333
1.24865
22
1.24137
1.23968
1.24373
1.24315
1.24187
1.24359
1.24121
1.23840
1.23871
1.24625
1.25312
1.24943
31
1.24009
1.23827
1.24261
1.24222
1.24062
1.24123
1.23713
1.23483
1.23422
1.24336
1.25284
1.24945
50
1.23767
1.23588
1.24024
1.23951
1.23813
1.23416
1.22869
1.22645
1.22438
1.23707
1.25331
1.24909
1.24343
0.00138
1.24720
1.23965
1.24273
0.00154
1.24696
1.23850
1.24196
0.00159
1.24632
1.23760
1.24076
0.00175
1.24555
1.23597
1.23828
0.00170
1.24293
1.23363
1.24576
0.00227
1.25199
1.23954
1.20
PASS
PASS
1.30
PASS
PASS
1.24318
0.00301
1.25142
1.23493
1.20
PASS
PASS
1.30
PASS
PASS
1.24163
0.00333
1.25076
1.23250
1.20
PASS
PASS
1.30
PASS
PASS
1.23815
0.00400
1.24913
1.22717
1.23015
0.00532
1.24472
1.21558
1.20
PASS
PASS
1.30
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
PASS
PASS
PASS
PASS
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TID LDR RH117H W10905063.1 W10
Line Reg. (%/V) @ 3V≤ VIN - VOUT ≤40V, IL = 10mA
0.023
Specification MAX
0.018
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (+KTL) Biased
0.013
Average All GND'd
0.008
Average Biased
Ps90%/90% (-KTL) All GND'd
0.003
Ps90%/90% (-KTL) Biased
-0.002
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.2: Plot of Line Regulation versus Total Dose
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TID LDR RH117H W10905063.1 W10
Table 5.2: Raw data for line regulation versus total dose including the statistical calculations,
maximum specification, and the status of the test (PASS/FAIL under the second orange header)
Parameter Line Reg. @ 3V≤VI-VO≤40V,IL =10mA
Units
(%/V)
770
All GND'd Irradiation
771
All GND'd Irradiation
772
All GND'd Irradiation
773
All GND'd Irradiation
774
All GND'd Irradiation
765
Biased Irradiation
766
Biased Irradiation
767
Biased Irradiation
768
Biased Irradiation
769
Biased Irradiation
723
Control Unit
724
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
0.001013
0.001265
0.000953
0.000868
0.001197
0.000824
0.001258
0.001239
0.001058
0.001301
0.001150
0.000967
11
0.000937
0.001325
0.000914
0.001083
0.001299
0.001123
0.001020
0.001240
0.001147
0.001410
0.001406
0.001284
22
0.001136
0.001412
0.001095
0.000995
0.001306
0.001219
0.001326
0.001536
0.001656
0.001467
0.001316
0.001132
31
0.001411
0.001597
0.000325
0.001263
0.001471
0.001325
0.001436
0.001455
0.001564
0.000574
0.001312
0.001274
50
0.001518
0.001292
0.001245
0.001164
0.001496
0.001251
0.001530
0.001511
0.001850
0.001499
0.001092
0.001010
0.001059
0.000167
0.001517
0.000601
0.001112
0.000194
0.001644
0.000579
0.001189 0.001213
0.000168 0.000511
0.001650 0.002614
0.000728 -0.000187
0.001343
0.000157
0.001773
0.000912
0.001136
0.000198
0.001678
0.000594
0.001188
0.000147
0.001590
0.000786
0.001441
0.000172
0.001913
0.000969
0.001528
0.000213
0.002112
0.000944
0.02
PASS
PASS
0.02
PASS
PASS
0.02
PASS
PASS
0.02
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
0.001271
0.000399
0.002364
0.000177
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TID LDR RH117H W10905063.1 W10
Load Reg. (mV) @ 10mA≤IL ≤0.5A, VOUT ≤ 5V
55.00
Specification MAX
45.00
Ps90%/90% (+KTL) All GND'd
35.00
Ps90%/90% (+KTL) Biased
25.00
Average All GND'd
Average Biased
15.00
Ps90%/90% (-KTL) All GND'd
5.00
Ps90%/90% (-KTL) Biased
-5.00
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.3: Plot of Load Regulation (VOUT ≤ 5V) versus Total Dose
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TID LDR RH117H W10905063.1 W10
Table 5.3: Raw data for load regulation (VOUT ≤ 5V) versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL).
Parameter Load Reg @ 10mA≤IL ≤0.5A,VO ≤ 5V
Units
(mV)
770
All GND'd Irradiation
771
All GND'd Irradiation
772
All GND'd Irradiation
773
All GND'd Irradiation
774
All GND'd Irradiation
765
Biased Irradiation
766
Biased Irradiation
767
Biased Irradiation
768
Biased Irradiation
769
Biased Irradiation
723
Control Unit
724
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
0.29278
0.99945
1.24645
0.19741
0.98991
0.79727
0.05341
0.11063
-0.14496
0.58746
0.49019
0.96989
11
0.92793
0.40722
0.84782
0.15354
1.24455
1.46484
0.67902
0.64278
0.85735
0.52547
-0.08106
1.09196
22
1.13964
0.69332
0.95177
0.16022
1.18637
1.23787
0.69141
1.06525
1.09386
0.47779
0.09441
0.43011
31
1.40762
1.16730
1.50108
0.19741
1.36852
1.49250
1.06335
1.13964
1.25504
0.69237
0.39101
0.37766
50
1.32656
0.95463
1.81294
0.55408
1.63174
1.91784
0.98419
1.53732
1.39427
0.77343
-0.20885
0.73624
0.74520
0.46919
2.03171
-0.54131
0.71621
0.43398
1.90618
-0.47376
0.82626
0.41980
1.97735
-0.32483
1.12839
0.53450
2.59399
-0.33722
1.25599
0.50986
2.65404
-0.14206
0.28076
0.39456
1.36266
-0.80113
0.83389
0.37225
1.85461
-0.18682
0.91324
0.31620
1.78027
0.04621
1.12858
0.29287
1.93162
0.32553
1.32141
0.45323
2.56416
0.07867
15
PASS
PASS
36
PASS
PASS
42
PASS
PASS
48
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
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TID LDR RH117H W10905063.1 W10
Load Reg (%) @ 10mA≤IL≤0.5A,VOUT ≥ 5V
1.20
1.00
Specification MAX
0.80
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (+KTL) Biased
0.60
Average Biased
0.40
Average All GND'd
0.20
Ps90%/90% (-KTL) Biased
0.00
Ps90%/90% (-KTL) All GND'd
-0.20
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.4: Plot of Load Regulation (VOUT ≥ 5V) versus Total Dose
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TID LDR RH117H W10905063.1 W10
Table 5.4: Raw data for line regulation (VOUT ≥ 5V) versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL).
Parameter Load Reg @ 10mA≤IL ≤0.5A, VO≥5V
Units
(%)
770
All GND'd Irradiation
771
All GND'd Irradiation
772
All GND'd Irradiation
773
All GND'd Irradiation
774
All GND'd Irradiation
765
Biased Irradiation
766
Biased Irradiation
767
Biased Irradiation
768
Biased Irradiation
769
Biased Irradiation
723
Control Unit
724
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
0.02354
0.08046
0.10004
0.01586
0.07954
0.06391
0.00429
0.00890
-0.01165
0.04701
0.03913
0.07764
11
0.07465
0.03281
0.06807
0.01234
0.10007
0.11758
0.05463
0.05181
0.06901
0.04210
-0.00647
0.08737
22
0.09172
0.05590
0.07647
0.01289
0.09544
0.09944
0.05567
0.08594
0.08823
0.03832
0.00753
0.03441
31
0.11338
0.09418
0.12066
0.01589
0.11019
0.12010
0.08588
0.09221
0.10158
0.05565
0.03120
0.03022
50
0.10707
0.07718
0.14596
0.04468
0.13162
0.15516
0.08004
0.12519
0.11375
0.06248
-0.01667
0.05891
0.05989
0.03769
0.16323
-0.04345
0.05759
0.03488
0.15323
-0.03805
0.06648
0.03376
0.15906
-0.02610
0.09086
0.04301
0.20880
-0.02708
0.10130
0.04103
0.21381
-0.01121
0.02249
0.03162
0.10918
-0.06420
0.06702
0.02986
0.14889
-0.01485
0.07352
0.02549
0.14343
0.00362
0.09108
0.02364
0.15591
0.02626
0.10732
0.03675
0.20810
0.00654
0.30
PASS
PASS
0.72
PASS
PASS
0.84
PASS
PASS
0.96
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
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TID LDR RH117H W10905063.1 W10
110
Specification MAX
Adjust Pin Current (uA)
100
90
Ps90%/90% (+KTL) All GND'd
80
Ps90%/90% (+KTL) Biased
70
Average All GND'd
60
Average Biased
50
Ps90%/90% (-KTL) All GND'd
40
Ps90%/90% (-KTL) Biased
30
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.5: Plot of Adjust Pin Current versus Total Dose
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TID LDR RH117H W10905063.1 W10
Table 5.5: Raw data for adjust pin current versus total dose including the statistical calculations,
minimum specification, and the status of the test (PASS/FAIL)
Parameter
Units
770
771
772
773
774
765
766
767
768
769
723
724
Adjust Pin Current
(uA)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
11
22
31
50
37.08567 36.99123 36.84251 36.90289 36.85178
38.93988 38.76894 38.66531 38.50042 38.41770
37.16185 37.07067 36.85321 36.94807 36.73279
36.91572 36.80050 36.78321 36.69865 36.48647
38.71296 38.67036 38.40386 38.40662 38.06429
36.79207 36.75817 36.29581 36.14735 35.55716
38.10320 38.18554 37.15717 37.48630 36.62807
39.12902 39.10086 38.43596 38.30571 37.76563
39.13496 38.72780 38.61774 38.29262 37.60857
38.20905 37.94770 37.76065 37.81404 37.05524
38.21854 38.24239 37.84626 38.16810 37.84653
37.95937 37.92437 37.37463 37.79620 37.47648
37.76322
0.97795
40.44474
35.08169
37.66034
0.97261
40.32724
34.99344
37.50962
0.94059
40.08873
34.93051
37.49133
0.88399
39.91523
35.06743
37.31061
0.86852
39.69208
34.92913
38.27366
0.96201
40.91148
35.63584
38.14401
0.89683
40.60311
35.68492
37.65347
0.95435
40.27030
35.03663
37.60920
0.88688
40.04104
35.17737
36.92293
0.88742
39.35623
34.48964
100
PASS
PASS
100
PASS
PASS
100
PASS
PASS
100
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 15 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Adjust Pin Current Change (uA) @ 10mA≤ IL ≤ 0.5A
6.00
5.00
Specification MAX
Ps90%/90% (+KTL) All GND'd
4.00
Ps90%/90% (+KTL) Biased
3.00
Average All GND'd
2.00
Average Biased
1.00
Ps90%/90% (-KTL) All GND'd
0.00
Ps90%/90% (-KTL) Biased
-1.00
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.6: Plot of Adjust Pin Current Change @ 10mA ≤ IL ≤ 0.5A versus Total Dose
P a g e 16 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Table 5.6: Raw data for adjust pin current change @ 10mA ≤ IL ≤ 0.5A versus total dose including
the statistical calculations, minimum specification, and the status of the test (PASS/FAIL)
Total Dose (Krads(Si)) @ 10 mrads/s
Parameter Adj. Pin I Change @ 10mA ≤ IL ≤0.5A
Units
(uA)
0
11
22
31
770
All GND'd Irradiation
0.00000
-0.00359 -0.01190 -0.00476
771
All GND'd Irradiation
0.01780
-0.01839 -0.02379 -0.01071
772
All GND'd Irradiation
0.00712
0.02273
-0.01887 0.00000
773
All GND'd Irradiation
0.02375
-0.02679 0.01665
0.02855
774
All GND'd Irradiation
0.00237
0.04069
0.03329
-0.02734
765
Biased Irradiation
0.00000
0.05073
-0.03686 -0.02379
766
Biased Irradiation
0.04866
-0.03516 0.00357
-0.05351
767
Biased Irradiation
0.00119
-0.02392 -0.01308 0.00000
768
Biased Irradiation
0.03204
0.03829
0.02973
0.01071
769
Biased Irradiation
-0.00972 -0.03351 0.02023
-0.01665
723
Control Unit
0.03820
0.02394
0.01071
-0.01784
724
Control Unit
0.01781
0.04069
-0.03210 -0.00119
All GND'd Irradiation Statistics
Average All GND'd
0.01021
0.00293
-0.00093 -0.00285
Std Dev All GND'd
0.01020
0.02828
0.02473
0.02037
Ps90%/90% (+KTL) All GND'd
0.03817
0.08046
0.06687
0.05300
Ps90%/90% (-KTL) All GND'd
-0.01776 -0.07461 -0.06872 -0.05870
Biased Irradiation Statistics
Average Biased
0.01444
-0.00072 0.00072
-0.01665
Std Dev Biased
0.02474
0.04174
0.02661
0.02467
Ps90%/90% (+KTL) Biased
0.08228
0.11373
0.07369
0.05101
Ps90%/90% (-KTL) Biased
-0.05341 -0.11516 -0.07226 -0.08430
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
5
5
5
Status (Measurements) All GND'd
PASS
PASS
PASS
Status (Measurements) Biased
PASS
PASS
PASS
50
-0.00237
0.00000
-0.08686
0.00000
-0.04879
-0.06187
-0.06783
-0.05592
0.01786
-0.05474
0.01308
-0.02618
-0.02760
0.03912
0.07966
-0.13487
-0.04450
0.03525
0.05215
-0.14115
5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 17 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Adj. Pin I Change (uA) @ 2.5V≤ VIN - VOUT ≤ 40V,
IL = 10mA
6.00
5.00
Specification MAX
Ps90%/90% (+KTL) Biased
4.00
Ps90%/90% (+KTL) All GND'd
3.00
Average All GND'd
2.00
Average Biased
1.00
Ps90%/90% (-KTL) All GND'd
Ps90%/90% (-KTL) Biased
0.00
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.7: Plot of Adjust Pin Current Change @ 2.5V ≤ VIN – VOUT ≤ 40V versus Total Dose
P a g e 18 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Table 5.7: Raw data table for adjust pin current change @ 2.5V ≤ VIN – VOUT ≤ 40V versus total
dose including the statistical calculations, maximum specification, and the status of the test
(PASS/FAIL)
Parameter Delta Adj. I @ 2.5V≤VI-VO≤40V,IL=10mA
Units
(uA)
770
All GND'd Irradiation
771
All GND'd Irradiation
772
All GND'd Irradiation
773
All GND'd Irradiation
774
All GND'd Irradiation
765
Biased Irradiation
766
Biased Irradiation
767
Biased Irradiation
768
Biased Irradiation
769
Biased Irradiation
723
Control Unit
724
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
0.07618
0.08686
0.05816
0.07004
0.10467
0.07381
0.06765
0.06885
0.10920
0.05103
0.06647
0.07240
11
0.09978
0.13043
0.07778
0.10052
0.09619
0.05550
0.08616
0.06627
0.09738
0.11892
0.08063
0.05146
22
0.09974
0.10448
0.09974
0.09379
0.11400
0.13423
0.10926
0.09498
0.10584
0.10464
0.14731
0.13794
31
0.04756
0.10582
0.05827
0.07611
0.09974
0.07015
0.09022
0.10924
0.08070
0.07611
0.09751
0.08443
50
0.10114
0.07139
0.08567
0.08568
0.06307
0.06783
0.08686
0.09163
0.12375
0.05950
0.06783
0.08567
0.07918
0.01763
0.12752
0.03085
0.10094
0.01891
0.15279
0.04909
0.10235
0.00754
0.12302
0.08168
0.07750
0.02532
0.14694
0.00806
0.08139
0.01468
0.12165
0.04113
0.07411
0.02141
0.13281
0.01541
0.08485
0.02513
0.15375
0.01594
0.10979
0.01465
0.14997
0.06961
0.08529
0.01527
0.12715
0.04342
0.08591
0.02495
0.15433
0.01750
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 19 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Min. Load Current (mA) @ VIN - VOUT = 40V
5.50
5.00
Specification MAX
4.50
Ps90%/90% (+KTL) Biased
4.00
Ps90%/90% (+KTL) All GND'd
3.50
Average All GND'd
3.00
Average Biased
2.50
2.00
Ps90%/90% (-KTL) All GND'd
1.50
Ps90%/90% (-KTL) Biased
1.00
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.8: Plot of Minimum Load Current versus Total Dose
P a g e 20 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Table 5.8: Raw data table for minimum load current versus total dose including the statistical
calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter Min. Load Current @ VI - VO = 40V
Units
(mA)
770
All GND'd Irradiation
771
All GND'd Irradiation
772
All GND'd Irradiation
773
All GND'd Irradiation
774
All GND'd Irradiation
765
Biased Irradiation
766
Biased Irradiation
767
Biased Irradiation
768
Biased Irradiation
769
Biased Irradiation
723
Control Unit
724
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
1.72664
1.87605
1.66874
1.66432
1.78264
1.58402
1.81258
1.76009
1.84115
1.63019
1.91924
1.61023
11
1.74779
1.89191
1.68207
1.67637
1.78494
1.59762
1.79877
1.73304
1.88176
1.62930
1.92592
1.62165
22
1.74851
1.88427
1.68821
1.66064
1.79360
1.64130
1.90818
1.80517
1.88495
1.64639
1.95288
1.66574
31
1.75266
1.89643
1.68689
1.66808
1.79570
1.64494
1.86582
1.79631
1.89643
1.62460
1.92650
1.62460
50
1.78722
1.91652
1.73774
1.69741
1.85362
1.65791
1.88541
1.79697
1.89517
1.66081
1.95182
1.64815
1.74368
0.08838
1.98601
1.50134
1.75661
0.08829
1.99871
1.51452
1.75504
0.08889
1.99878
1.51131
1.75995
0.09184
2.01177
1.50813
1.79850
0.08804
2.03991
1.55708
1.72560
0.11320
2.03600
1.41521
1.72810
0.11770
2.05084
1.40536
1.77720
0.12760
2.12708
1.42732
1.76562
0.12505
2.10850
1.42274
1.77926
0.11594
2.09718
1.46134
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
5
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 21 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Current Limit (mA) @ VIN - VOUT = 15V
1300
1200
Ps90%/90% (+KTL) Biased
1100
Ps90%/90% (+KTL) All GND'd
1000
Average All GND'd
900
Average Biased
800
Ps90%/90% (-KTL) All GND'd
700
600
Ps90%/90% (-KTL) Biased
500
Specification MIN
400
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.9: Plot of Current Limit @ VIN – VOUT = 15V versus Total Dose
P a g e 22 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Table 5.9: Raw data table for current limit @ VIN – VOUT ≤ 15V versus total dose including the
statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter
Units
770
771
772
773
774
765
766
767
768
769
723
724
Current Limit @ VIN - VOUT = 15V
(mA)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
1013.014
1046.276
979.865
1007.659
1021.238
950.679
1035.005
985.983
1002.033
978.490
1064.786
989.091
11
1028.922
1060.274
995.167
1022.344
1037.271
969.705
1064.150
1006.035
1023.570
996.391
1062.098
987.601
22
1051.368
1082.367
1014.619
1042.090
1056.048
992.947
1082.638
1027.116
1051.510
1019.332
1063.190
988.392
31
1062.774
1089.179
1025.464
1051.096
1065.340
1006.041
1102.503
1041.761
1064.958
1033.859
1065.885
991.226
50
1093.904
1116.890
1050.642
1075.502
1090.834
1032.232
1133.448
1070.479
1096.445
1059.713
1076.303
999.435
1013.610
23.978
1079.357
947.864
1028.796
23.639
1093.614
963.977
1049.298
24.485
1116.435
982.161
1058.771
23.195
1122.372
995.169
1085.554
24.492
1152.712
1018.397
990.438
31.081
1075.661
905.214
500
PASS
PASS
1011.970
35.077
1108.151
915.789
500
PASS
PASS
1034.709
33.977
1127.872
941.545
500
PASS
PASS
1049.824
36.197
1149.077
950.572
1078.463
38.403
1183.766
973.161
500
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 23 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Current Limit (mA) @ VIN - VOUT = 40V
390
Ps90%/90% (+KTL) Biased
340
Ps90%/90% (+KTL) All GND'd
290
Average All GND'd
Average Biased
240
Ps90%/90% (-KTL) All GND'd
190
Ps90%/90% (-KTL) Biased
Specification MIN
140
0
10
20
30
40
50
60
Total Dose (Krads(Si))
Figure 5.10: Plot of Current Limit @ VIN – VOUT = 40V versus Total Dose
P a g e 24 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Table 5.10: Raw data table for current limit @ VIN – VOUT = 40V versus total dose including the
statistical calculations, maximum specification, and the status of the test (PASS/FAIL)
Parameter
Units
770
771
772
773
774
765
766
767
768
769
723
724
Current Limit @ VIN - VOUT = 40V
(mA)
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
All GND'd Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Biased Irradiation
Control Unit
Control Unit
All GND'd Irradiation Statistics
Average All GND'd
Std Dev All GND'd
Ps90%/90% (+KTL) All GND'd
Ps90%/90% (-KTL) All GND'd
Biased Irradiation Statistics
Average Biased
Std Dev Biased
Ps90%/90% (+KTL) Biased
Ps90%/90% (-KTL) Biased
Specification MIN
Status (Measurements) All GND'd
Status (Measurements) Biased
Specification MAX
Status (Measurements) All GND'd
Status (Measurements) Biased
Total Dose (Krads(Si)) @ 10 mrads/s
0
254.206
250.041
235.144
250.977
241.498
225.145
239.931
235.202
239.132
223.863
248.412
226.792
11
270.295
264.817
250.307
265.612
257.305
247.262
274.710
261.588
264.652
247.160
246.006
224.162
22
298.146
291.857
274.999
292.070
282.183
273.760
296.587
285.321
296.672
273.094
251.739
229.397
31
310.452
300.902
284.472
301.150
291.510
287.155
315.097
299.116
309.913
286.693
255.429
233.226
50
327.904
314.118
298.346
312.279
303.295
297.544
328.244
311.661
325.098
295.588
247.790
225.552
246.373
7.840
267.870
224.876
261.667
7.874
283.258
240.076
287.851
9.181
313.025
262.677
297.697
9.976
325.051
270.343
311.188
11.363
342.345
280.032
232.655
7.666
253.676
211.634
150
PASS
PASS
259.074
11.868
291.616
226.533
150
PASS
PASS
285.087
11.604
316.906
253.268
150
PASS
PASS
299.594
12.925
335.035
264.154
311.627
15.109
353.057
270.197
150
PASS
PASS
Status (-KTL) All GND'd
Status (+KTL) All GND'd
PASS
PASS
PASS
PASS
Status (-KTL) Biased
Status (+KTL) Biased
PASS
PASS
PASS
PASS
P a g e 25 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Appendix A
Figure A1: Top View showing ID and Date Code
Figure A2: Side View showing serial number
P a g e 26 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Appendix B
Radiation Bias Connection Tables
PIN
1
2
3
Table B1: Biased Conditions
FUNCTION
INPUT
ADJUST
OUTPUT
CONNECTION / BIAS
+15V,to -15V via 0.1µF
To -15V via 2KΩ
To -15V via 61.9Ω
PIN
1
2
3
Table B2: All GND’d
FUNCTION
INPUT
ADJUST
OUTPUT
CONNECTION / BIAS
Ground
Ground
Ground
P a g e 27 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Figure B1: Total Dose Bias Circuit
Figure B2: Pin-Out
P a g e 28 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Figure B3: Bias Board (top view)
Figure B4: Bias Board (bottom view)
P a g e 29 | 42
LINEAR TECHNOLOGY CORPORATION
TID LDR RH117H W10905063.1 W10
Appendix C
P a g e 30 | 42
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TID LDR RH117H W10905063.1 W10
P a g e 31 | 42
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
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TID LDR RH117H W10905063.1 W10
Appendix D
Table D1: Pre-Irradiation Electrical Characteristics of Device-Under-Test
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Table D2: Post-Irradiation Electrical Characteristics of Device-Under-Test
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