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INCH-POUND
MIL-M-38510/118B
04 AUGUST 2005
SUPERSEDING
MIL-M-38510/118A
05 November 2003
MILITARY SPECIFICATION
MICROCIRCUITS, LINEAR, ADJUSTABLE, NEGATIVE, VOLTAGE REGULATORS, MONOLITHIC SILICON
This specification is approved for use by all Departments and Agencies of the Department of Defense.
Reactivated for new design as of 05 November 2003. May be used for either new or existing design acquisition.
The requirement for acquiring the product herein shall consist of this specification sheet and MIL-PRF-38535.
1. SCOPE
1.1 Scope. This specification covers the detail requirements for three and four terminal monolithic silicon, adjustable,
negative, voltage regulators. Two product assurance classes and a choice of case outlines and lead finish are provided for
each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been
superseded by MIL-PRF-38535, (see 6.4).
1.2 Part or Identifying Number (PIN). The PIN is in accordance with MIL-PRF-38535, and as specified herein.
1.2.1 Device types. The device types are as shown in the following:
Device type
01
Circuit
Case outline letter
4-terminal voltage regulator,
X
-30 volts ≤ VO ≤ -5 volts at 0.5 A
02
4-terminal voltage regulator,
03
3-terminal voltage regulator,
04
3-terminal voltage regulator,
Y
-30 volts ≤ VO ≤ -5 volts at 1.0 A
X
-37 volts ≤ VO ≤ -1.25 volts at 0.5 A
Y
-37 volts ≤ VO ≤ -1.25 volts at 1.5 A
1.2.2 Device class. The device class is the product assurance level as defined in MIL-PRF-38535.
1.2.3 Case outlines. The case outlines are designated in MIL-STD-1835 and as follows:
Outline letter
X
Y
X
Y
Descriptive designator
See figure 1
See figure 2
See figure 3
See figure 4
Terminals
Device type
Package style
4
4
3
2
01
02
03
04
Can
Flange mount
Can
Flange mount
Comments, suggestions, or questions on this document should be addressed to: Commander, Defense
Supply Center Columbus, ATTN: DSCC-VAS, 3990 East Broad St., Columbus, OH 43218-3990, or emailed
to [email protected] Since contact information can change, you may want to verify the currency of this
address information using the ASSIST Online database at http://assist.daps.dla.mil.
AMSC N/A
FSC 5962
MIL-M-38510/118B
1.3 Absolute maximum ratings.
Input voltage (device types 01 and 02) ...........................................................
Input-output differential voltage (device types 03 and 04) ...............................
Lead temperature (soldering, 60 seconds) .....................................................
Junction temperature (TJ) ...............................................................................
Storage temperature range ............................................................................
-40 V
-40 V
+300°C
+150°C 1/
-65°C to +150°C
1.4 Recommended operating conditions.
Input voltage range:
Device types 01 and 02 .............................................................................. -8 V dc to -38 V dc
Device types 03 and 04 .............................................................................. -4.25 V dc to –41.25 V dc
Ambient operating temperature range (TA) .................................................... -55°C to +125°C
1.5 Power and thermal characteristics.
TA = TS
Case
Max θJA
125°C 3/
X
Y
X
Y
X
Y
140°C/W
35°C/W
140°C/W
35°C/W
140°C/W
35°C/W
25°C
-55°C
Maximum PD
with heat sink
0.18 W
0.71 W
0.89 W
3.60 W
1.50 W
5.80 W
Max θJC
40°C/W
4°C/W
40°C/W
4°C/W
40°C/W
4°C/W
Maximum PD
with heat sink
0.5 W
5.6 W
2.50 W
28.00 W
4.00 W
45.00 W
Max θC-S 2/
10°C/W
0.5°C/W
10°C/W
0.5°C/W
10°C/W
0.5°C/W
______
1/ The device is protected by a thermal shutdown circuit which is designed to turn off the output transistor whenever
the device junction temperature is in excess of 150°C.
2/ This value represents the maximum allowable thermal impedance of a heat sink to remain within the thermal ratings.
3/ Based on TJ = 150°C and specified values of θJA and θJC.
2
MIL-M-38510/118B
2. APPLICABLE DOCUMENTS
2.1 General. The documents listed in this section are specified in sections 3, 4, or 5 of this specification. This section
does not include documents cited in other sections of this specification or recommended for additional information or as
examples. While every effort has been made to ensure the completeness of this list, document users are cautioned that
they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specification, whether or not they
are listed.
2.2 Government documents.
2.2.1 Specifications, standards, and handbooks. The following specifications and standards form a part of this
specification to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATIONS
MIL-PRF-38535
- Integrated Circuits (Microcircuits) Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883
MIL-STD-1835
- Test Method Standard for Microelectronics.
- Interface Standard Electronic Component Case Outlines.
(Copies of these documents are available online at http://assist.daps.dla.mil/quicksearch/ or http://assist.daps.dla.mil or
from the Standardization Document Order Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.3 Order of precedence. In the event of a conflict between the text of this specification and the references cited herein,
the text of this document takes precedence. Nothing in this document, however, supersedes applicable laws and
regulations unless a specific exemption has been obtained.
3. REQUIREMENTS
3.1 Qualification. Microcircuits furnished under this specification shall be products that are manufactured by a
manufacturer authorized by the qualifying activity for listing on the applicable qualified manufacturers list before contract
award (see 4.3 and 6.3).
3.2 Item requirements. The individual item requirements shall be in accordance with MIL-PRF-38535 and as specified
herein or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall
not affect the form, fit, or function as described herein.
3.3 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as
specified in MIL-PRF-38535 and herein.
3.3.1 Block diagram and terminal connections. The block diagrams and terminal connections shall be as specified on
figures 5 through 8.
3.3.2 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the
qualifying activity and the preparing activity (DSCC-VA) upon request.
3.3.3 Case outlines. The case outlines shall be as specified in 1.2.3 and on figures 1, 2, 3, and 4.
3
MIL-M-38510/118B
3.4 Lead material and finish. Lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.4.1 Lead material. The lead material shall be in accordance with MIL-PRF-38535, or as follows:
Type X
Nickel .............................................................................. 50-53 percent
Manganese ..................................................................... 0.60 percent, maximum
Silicon ............................................................................. 0.30 percent, maximum
Carbon ............................................................................ 0.10 percent, maximum
Chromium ....................................................................... 0.25 percent, maximum
Cobalt ............................................................................. 0.50 percent, maximum
Phosphorous ................................................................... 0.025 percent, maximum
Sulfur ............................................................................. 0.025 percent, maximum
Aluminum ........................................................................ 0.10 percent maximum
Iron .............................................................................. Remainder
Type Y
Copper core ....................................................................24.75 percent, maximum
Clad with Alloy 52 ...........................................................75.25 percent maximum
3.5 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as
specified in table I and apply over the full operating ambient temperature range of –55°C to +125°C.
3.5.1 Stability. If the device is located an appreciable distance from the power supply filter, a solid tantalum bypass
capacitor should be connected as close to the device VCC input as possible to suppress oscillation. A solid tantalum bypass
capacitor is recommended on the device output. Output current oscillations may occur in the current limit operating mode.
Since load currents of less than 5 milliamperes may result in a loss of voltage regulation, regulators should be preloaded
with 5 milliamperes of load current in lightly loaded applications.
3.5.2 Test limit. The test limits specified in tables I and III apply only for the stated test conditions (example, 2 percent
duty cycle), which essentially keep the junction temperature constant. In most applications the junction temperature will
greatly exceed the 25°C ambient or sink temperature; thus devices may not perform within the 25°C specified limits.
3.6 Electrical test requirements. Electrical test requirements for each device class shall be the subgroups specified in
table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535. At the option of the manufacturer, marking of the
country of origin may be omitted from the body of the microcircuit, but shall be retained on the initial container.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 52
(see MIL-PRF-38535, appendix A).
4
MIL-M-38510/118B
TABLE I. Electrical performance characteristics.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output voltage
VOUT
Limits
Unit
Min
Max
-5.25
-4.75
Load current
01
VIN = -8 V
IL = 5 mA, 500 mA
VIN = -30 V
IL = 5 mA, 50 mA
-5.25
-4.75
VIN = -38 V
IL = 500 mA
-31.5
-28.5
VIN = -10 V,
IL = 5 mA
-5.25
-4.75
-150
150
-50
50
-100
100
-150
150
V
TA = 150°C
Line regulation
Load regulation
Thermal regulation
VRLINE
VRLOAD
VRTH
-30 V ≤ VIN ≤ -8 V
IL = 50 mA
-25 V ≤ VIN ≤ -8 V
IL = 350 mA
01
01
mV
mV
VIN = -10 V
5 mA ≤ IL ≤ 500 mA
VIN = -30 V
5 mA ≤ IL ≤ 50 mA
VIN = -15 V,
IL = 500 mA
01
-50
50
mV
VIN = -10 V
IL = 5 mA
01
0.1
3.0
mA
VIN = -30 V
IL = 5 mA
0.1
4.0
-30 V ≤ VIN ≤ -8 V
IL = 5 mA
01
-1.0
1.0
mA
VIN = -10 V
5 mA ≤ IL ≤ 500 mA
01
-0.5
0.5
mA
VIN = -10 V,
IL = 350 mA
01
0.001
2.00
µA
0.001
3.00
TA = 25°C
Standby current drain
ISCD
Standby current drain
change versus line
voltage
∆ISCD
Standby current drain
change versus load
current
∆ISCD
Control pin current
ICTL
(LINE)
(LOAD)
TA = 25°C
IL = 350 mA
VIN = -10 V,
-55°C ≤ TA ≤ 125°C
See footnotes at end of table.
5
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output short circuit current
Output voltage recovery
after output short
IOS1
VIN = -10 V
IOS2
VIN = -30 V
VOUT
VIN = -10 V,
(RECOV)
after IOS1
circuit current
Unit
Min
Max
0.002
2.0
0.002
1.0
-5.25
-4.75
-5.25
-4.75
01
-5.25
-4.75
01
45
Load current
01
3/
Limits
RL = 10 Ω,
01
A
V
CL = 20 µF
VIN = -30 V,
3/
RL = 5 kΩ
after IOS2
Voltage start-up
VSTART
RL = 10 Ω,
VIN = -20 V
V
CL = 20 µF
Ripple rejection
∆VIN /
VIN = -10 V,
∆VOUT
ei = 1 Vrms,
4/
Line transient response
see figure 10
VIN = -10 V, 4/
IL = 50 mA,
see figure 11
TA = 25°C
∆VOUT /
VIN = -10 V, 5/
IL = 5 mA,
∆VIN
Vpulse = -3.0 V,
TA = 25°C
VNO
dB
TA = 25°C,
at f = 2400 Hz
Output noise voltage
IL = 125 mA,
01
250
µVrms
01
30
mV/V
01
2.5
mV/mA
see figure 12
Load transient response
∆VOUT /
VIN = -10 V, 5/
∆IL
see figure 13
IL = 50 mA,
∆IL = 200 mA
TA = 25°C
See footnotes at end of table.
6
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output voltage
VOUT
Limits
Unit
Min
Max
-5.25
-4.75
Load current
02
VIN = -8 V
IL = 5 mA, 1 A
VIN = -30 V
IL = 5 mA, 100 mA
-5.25
-4.75
VIN = -38 V
IL = 1 A
-31.5
-28.5
VIN = -10 V,
IL = 5 mA
-5.25
-4.75
-150
150
-75
75
-100
100
-150
150
V
TA = 150°C
Line regulation
Load regulation
Thermal regulation
VRLINE
VRLOAD
VRTH
-30 V ≤ VIN ≤ -8 V
IL = 100 mA
-25 V ≤ VIN ≤ -8 V
IL = 500 mA
02
02
mV
mV
VIN = -10 V
5 mA ≤ IL ≤ 1 A
VIN = -30 V
5 mA ≤ IL ≤ 100 mA
VIN = -15 V,
IL = 1 A
02
-50
50
mV
VIN = -10 V
IL = 5 mA
02
0.1
3.0
mA
VIN = -30 V
IL = 5 mA
0.1
4.0
-30 V ≤ VIN ≤ -8 V
IL = 5 mA
02
-1.0
1.0
mA
VIN = -10 V
5 mA ≤ IL ≤ 1 A
02
-0.5
0.5
mA
VIN = -10 V,
IL = 500 mA
02
0.01
2.00
µA
0.001
3.00
TA = 25°C
Standby current drain
ISCD
Standby current drain
change versus line
voltage
∆ISCD
Standby current drain
change versus load
current
∆ISCD
Control pin current
ICTL
(LINE)
(LOAD)
TA = 25°C
IL = 500 mA
VIN = -10 V,
-55°C ≤ TA ≤ 125°C
See footnotes at end of table.
7
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output short circuit current
Output voltage recovery
after output short
IOS1
VIN = -10 V
IOS2
VIN = -30 V
VOUT
VIN = -10 V,
(RECOV)
after IOS1
circuit current
Unit
Min
Max
0.002
4.5
0.002
2.0
-5.25
-4.75
-5.25
-4.75
02
-5.25
-4.75
02
45
Load current
02
3/
Limits
RL = 5 Ω,
02
A
V
CL = 20 µF
VIN = -30 V,
3/
RL = 5 kΩ
after IOS2
Voltage start-up
VSTART
RL = 5 Ω,
VIN = -20 V
V
CL = 20 µF
Ripple rejection
Output noise voltage
Line transient response
∆VIN /
VIN = -10 V,
∆VOUT
ei = 1 Vrms,
VNO
4/
IL = 350 mA,
dB
TA = 25°C,
at f = 2400 Hz
see figure 10
VIN = -10 V, 4/
IL = 100 mA,
see figure 11
TA = 25°C
∆VOUT /
VIN = -10 V, 5/
IL = 5 mA,
∆VIN
Vpulse = -3.0 V,
TA = 25°C
02
250
µVrms
02
30
mV/V
02
2.5
mV/mA
see figure 12
Load transient response
∆VOUT /
VIN = -10 V, 5/
IL = 100 mA,
∆IL
see figure 13
∆IL = 400 mA
TA = 25°C
See footnotes at end of table.
8
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output voltage
VOUT
Limits
Unit
Min
Max
-1.275
-1.225
IL = 5 mA, 500 mA
-1.30
-1.20
IL = 5 mA, 50 mA
-1.275
-1.225
IL = 5 mA, 50 mA
-1.30
-1.20
IL = 5 mA
-1.30
-1.20
-9
9
-23
23
-6
6
5 mA ≤ IL ≤ 200 mA
-12
12
5 mA ≤ IL ≤ 500 mA
-12
12
5 mA ≤ IL ≤ 500 mA
-24
24
5 mA ≤ IL ≤ 50 mA
-6
6
5 mA ≤ IL ≤ 50 mA
-12
12
Load current
IL = 5 mA, 500 mA
VIN = -4.25 V,
03
V
TA = 25°C
VIN = -4.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -41.25 V,
TA = 25°C
VIN = -41.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -6.25 V,
TA = 150°C
Line regulation
VRLINE
-41.25 V ≤ VIN ≤ -4.25 V,
IL = 5 mA
03
mV
TA = 25°C
-41.25 V ≤ VIN ≤ -4.25 V,
IL = 5 mA
-55°C ≤ TA ≤ 125°C
Load regulation
VRLOAD
5 mA ≤ IL ≤ 200 mA
VIN = -6.25 V,
03
TA = 25°C
VIN = -6.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -6.25 V,
TA = 25°C
VIN = -6.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -41.25 V,
TA = 25°C
VIN = -41.25 V,
-55°C ≤ TA ≤ 125°C
See footnotes at end of table.
9
mV
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Limits
Unit
Min
Max
Load current
IL = 500 mA
03
-5
5
mV
VIN = -4.25 V
IL = 5 mA
03
25
100
µA
VIN = -41.25 V
IL = 5 mA
25
100
∆IADJ
VIN = -41.25 V
IL = 5 mA
25
100
(LINE)
-41.25 V ≤ VIN ≤ -4.25 V
IL = 5 mA
-5
5
Adjust pin current
change versus
load current
∆IADJ
VIN = -6.25 V
03
-5
5
µA
Minimum load
current
IQ
03
0.20
3.00
mA
1.00
5.00
0.5
1.8
0.05
0.5
-1.30
-1.20
-1.30
-1.20
03
-1.30
-1.20
03
48
Thermal regulation
VRTH
VIN = -14.6 V,
TA = 25°C
Adjust pin current
Adjust pin current
change versus
line voltage
IADJ
5 mA ≤ IL ≤ 500 mA
03
µA
(LOAD)
-14.25 V ≤ VIN ≤ -4.25 V,
forced VOUT = -1.4 V
VIN = -41.25 V forced
VOUT = -1.4 V
Output short
circuit current
Output voltage
recovery after
IOS1
VIN = -4.25 V
IOS2
VIN = -40 V
VOUT
VIN = -4.25 V,
(RECOV)
after IOS1
output short
circuit current
Voltage start-up
VIN = -40 V,
03
RL = 2.5 Ω,
3/
03
A
V
CL = 10 µF
RL = 250 Ω
3/
after IOS2
VSTART
RL = 2.5 Ω,
VIN = -4.25 V
V
CL = 10 µF
Ripple rejection
∆VIN /
VIN = -6.25 V,
∆VOUT
ei = 1 Vrms,
IL = 125 mA,
6/
TA = 25°C,
at fo = 2400 Hz
see figure 10
See footnotes at end of table.
10
dB
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output noise voltage
Line transient response
Min
Unit
Max
Load current
VIN = -6.25 V, 4/
IL = 50 mA,
see figure 11
TA = 25°C
∆VOUT /
VIN = -6.25 V, 5/
IL = 50 mA,
∆VIN
∆VIN = -1.0 V,
TA = 25°C
VNO
Limits
03
120
µVrms
03
80
mV/V
03
0.30
see figure 12
Load transient response
∆VOUT /
VIN = -6.25 V, 5/
∆IL
see figure 13
IL = 50 mA,
mV/mA
∆IL = 200 mA
TA = 25°C
Output voltage
VOUT
-1.275
-1.225
IL = 5 mA, 1.5 A
-1.30
-1.20
IL = 5 mA, 200 mA
-1.275
-1.225
IL = 5 mA, 200 mA
-1.30
-1.20
IL = 5 mA
-1.30
-1.20
-9
9
-23
23
IL = 5 mA, 1.5 A
VIN = -4.25 V,
04
V
TA = 25°C
VIN = -4.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -41.25 V,
TA = 25°C
VIN = -41.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -6.25 V,
TA = 150°C
Line regulation
VRLINE
-41.25 V ≤ VIN ≤ -4.25 V,
IL = 5 mA
04
TA = 25°C
-41.25 V ≤ VIN ≤ -4.25 V,
-55°C ≤ TA ≤ 125°C
See footnotes at end of table.
11
IL = 5 mA
mV
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Load regulation
VRLOAD
Limits
Unit
Min
Max
-6
6
5 mA ≤ IL ≤ 1.5 A
-12
12
5 mA ≤ IL ≤ 150 mA
-6
6
5 mA ≤ IL ≤ 150 mA
-12
12
Load current
5 mA ≤ IL ≤ 1.5 A
VIN = -6.25 V,
04
mV
TA = 25°C
VIN = -6.25 V,
-55°C ≤ TA ≤ 125°C
VIN = -41.25 V,
TA = 25°C
VIN = -41.25 V,
-55°C ≤ TA ≤ 125°C
Thermal regulation
VRTH
IL = 1.5 A
04
-5
5
mV
VIN = -4.25 V
IL = 5 mA
04
25
100
µA
VIN = -41.25 V
IL = 5 mA
25
100
-41.25 V ≤ VIN ≤ -4.25 V
IL = 5 mA
04
-5
5
µA
5 mA ≤ IL ≤ 1.5 A
04
-5
5
µA
04
0.20
3.00
mA
1.00
5.00
1.5
3.5
0.2
1.0
VIN = -14.6 V,
TA = 25°C
Adjust pin current
IADJ
Adjust pin current
change versus line
voltage
∆IADJ
Adjust pin current
change versus
load current
∆IADJ
Minimum load current
IQ
(LINE)
VIN = -6.25 V
(LOAD)
-14.25 V ≤ VIN ≤ -4.25 V,
forced VOUT = -1.4 V
VIN = -41.25 V forced
VOUT = -1.4 V
Output short circuit
current
IOS1
VIN = -4.25 V
IOS2
VIN = -40 V
04
See footnotes at end of table.
12
A
MIL-M-38510/118B
TABLE I. Electrical performance characteristics – Continued.
Test
Conditions 1/ 2/
-55°C ≤ TA ≤ +125°C
Symbol
Device
type
see figure 9 and 3.5
unless otherwise specified
Input voltage
Output voltage recovery
after output short
VOUT
VIN = -4.25 V,
(RECOV)
after IOS1
circuit current
Limits
Unit
Min
Max
-1.30
-1.20
-1.30
-1.20
04
-1.30
-1.20
04
50
Load current
3/
RL = 0.833 Ω,
04
V
CL = 10 µF
VIN = -40 V,
RL = 250 Ω
3/
after IOS2
Voltage start-up
VSTART
RL = 0.833 Ω,
VIN = -4.25 V
V
CL = 10 µF
Ripple rejection
Output noise voltage
∆VIN /
VIN = -6.25 V,
∆VOUT
ei = 1 Vrms,
VNO
6/
dB
TA = 25°C,
at fo = 2400 Hz
see figure 10
VIN = -6.25 V, 4/
IL = 100 mA,
see figure 11
Line transient response
IL = 500 mA,
∆VOUT /
VIN = -6.25 V, 5/
∆VIN
∆VIN = -1.0 V,
04
120
µVrms
04
80
mV/V
04
0.15
TA = 25°C
IL = 100 mA,
TA = 25°C
see figure 12
Load transient response
∆VOUT /
VIN = -6.25 V, 5/
IL = 100 mA,
∆IL
see figure 13
∆IL = 400 mA
mV/mA
TA = 25°C
1/
All tests performed at TA = 125°C may at the manufacturer’s option, be performed at TA = 150°C.
Specifications for TA = 125°C shall then apply at TA = 150°C.
2/
Static tests with load currents greater than 5 mA are performed under pulsed conditions defined on figure 9.
3/
Output voltage recovery test shall be performed, with the designated load conditions, immediately after removal
of each IOS test forced output voltage condition.
4/
The meter for ei and eo shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure true rms voltages.
5/
The oscilloscope shall have a bandwidth between 5 and 15 MHz.
6/
The meter for ei and eo shall have a minimum bandwidth from 300 Hz to 10 kHz and shall measure true rms voltage.
13
MIL-M-38510/118B
4. VERIFICATION.
4.1 Sampling and inspection. Sampling and inspection procedures should be in accordance with MIL-PRF-38535 or as
modified in the device manufacturer’s Quality Management (QM) plan. The modification in the QM plan shall not affect the
form, fit, or function as described herein.
4.2 Screening. Screening shall be in accordance with MIL-PRF-38535, and shall be conducted on all devices prior to
qualification and quality conformance inspection. The following additional criteria shall apply:
a.
For class S and B devices, an additional burn-in screen shall be performed to test the operation of the thermal
shutdown circuit. This screen shall be performed after serialization (3.1.8 of method 5004 of MIL-STD-883) and
before interim electrical parameters (pre burn-in, 3.1.9 of method 5004 of MIL-STD-883). The requirements of
3.2.3 of method 1015 of MIL-STD-883 shall apply to this screen except the devices need not be tested in an oven.
b.
The burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained
under document control by the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit
shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent
specified in test method 1015 of MIL-STD-883.
c.
Interim and final electrical test parameters shall be as specified in table II, except interim electrical parameters test
prior to burn-in is optional at the discretion of the manufacturer.
d.
Additional screening for space level product shall be as specified in MIL-PRF-38535.
e.
Constant acceleration (method 2001 of MIL-STD-883); test condition B shall be used for case Y.
4.3 Qualification inspection. Qualification inspection shall be in accordance with MIL-PRF-38535.
4.4 Technology Conformance inspection (TCI). Technology conformance inspection shall be in accordance with MILPRF-38535 and herein for groups A, B, C, and D inspections (see 4.4.1 through 4.4.4).
4.4.1 Group A inspection. Group A inspection shall be in accordance with table III of MIL-PRF-38535 and as follows:
a.
Tests shall be as specified in table II herein.
b.
Subgroups 5, 6, 8, 9, 10, and 11 shall be omitted.
4.4.2 Group B inspection. Group B inspection shall be in accordance with table II of MIL-PRF-38535 and as follows:
a.
End point electrical parameters shall be as specified in table II herein.
b.
When using the method 5005 option, constant acceleration for class S (method 2001 of MIL-STD-883);
test condition B shall be used for case Y.
4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:
a.
End point electrical parameters shall be as specified in table IV herein. Delta limits shall apply to subgroup 1
of group C inspection for class B devices.
b.
The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as
specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall
be maintained under document control by the device manufacturer's Technology Review Board (TRB) in
accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request.
The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with
the intent specified in test method 1005 of MIL-STD-883.
14
MIL-M-38510/118B
TABLE II. Electrical test requirements.
MIL-PRF-38535
test requirements
Subgroups (see table III)
Class S
devices
Class B
devices
Interim electrical parameters
1
1
Final electrical test parameters 1/
1,2,3,4
1,2,3,4
Group A test requirements
1,2,3,4,7
1,2,3,4,7
Group B electrical test parameters
when using the method 5005 QCI
option
Group C electrical parameters
1,2,3, and
table IV delta
limits
1,2,3, and
table IV delta
limits
Not applicable
N/A
1 and
table IV delta
limits
None
1,2,3
1
Additional electrical subgroups
for group C periodic inspections
Group D end point electrical
parameters
1/ PDA applies to subgroup 1.
4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535 and as follows:
a.
End point electrical parameters shall be as specified in table II herein.
b.
Constant acceleration (method 2001 of MIL-STD-883); test condition B shall be used for case Y.
4.5 Methods of inspection. Methods of inspection shall be as specified and as follows.
4.5.1 Voltage and current. All voltage values given are referenced to the designated return sense line. Currents given
are conventional current and positive when flowing into the referenced terminal.
4.5.2 Life test and burn-in cool down procedure. When devices are measured at +25°C following application of the
operating life or burn-in condition, they shall be cooled to room temperature prior to removal of the bias.
4.5.3 Inspection of packaging. The sampling and inspection of the preservation – packaging, packing, and container
marking shall be in accordance with the requirements of MIL-PRF-38535.
5. PACKAGING
5.1 Packaging requirements. For acquisition purposes, the packaging requirements shall be as specified in the contract
or order (see 6.2). When packaging of materiel is to be performed by DoD or in-house contractor personnel, these
personnel need to contact the responsible packaging activity to ascertain packaging requirements. Packaging requirements
are maintained by the Inventory Control Point's packaging activity within the Military Service or Defense Agency, or within
the military’s service system command. Packaging data retrieval is available from the managing Military Department's or
Defense Agency's automated packaging files, CD-ROM products, or by contacting the responsible packaging activity.
15
MIL-M-38510/118B
Symbol
A
φb
φb1
φD
φD1
e
e1
F
k
k1
k2
L
L1
L2
α
Dimensions
Inches
Millimeters
Min
Max
Min
Max
.240
.260
6.10
6.60
.016
.019
.41
.48
.016
.021
.41
.53
Notes
3
3
.335
.305
.370
.335
8.51
7.79
9.40
8.51
.200
.100
T.P.
T.P.
5.08
2.54
T.P
T.P
5
5
--.028
.029
.050
.034
.045
--.71
.74
1.27
.86
1.14
4
.009
.041
.23
1.04
.500
---
--.050
12.70
---
--1.27
.250
---
6.35
---
45°
T.P
45°
T.P
5
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm.
3. (Four leads) φb applies between L1 and L2. φb1 applies between L2 and .500 (12.70 mm) from the reference
4.
5.
6.
7.
plane. Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the reference plane.
Four leads.
Measured from the maximum diameter of the product.
Leads having a maximum diameter .019 (.48 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the base plane of the product shall be within .007 (.18 mm) of their true position
relative to a maximum width tab.
The product may be measured by direct methods or by gage.
FIGURE 1. Case outline X (device type 01).
16
MIL-M-38510/118B
Symbol
A
A1
Dimensions
Inches
Millimeters
Min
Max
Min
Max
.250
.450
6.35
11.43
1.177
1.197
29.90
30.40
1.480
1.500
37.59
38.10
.038
--.655
.420
.043
.875
.675
.440
.97
--16.64
10.67
1.09
22.22
17.14
11.18
.205
.225
5.21
5.72
.060
.151
.312
---
.135
.161
.500
.050
1.52
3.84
7.92
---
3.43
4.09
12.70
1.27
R1
.495
.131
.525
.188
12.57
3.33
13.34
4.78
R2
.470
T.P.
11.94
T.P.
θ1
54°
T.P.
54°
T.P.
θ2
18°
T.P.
18°
T.P.
A2
φb
φD
e
e1
e2
F
φH
L
L1
R
FIGURE 2. Case outline Y (device type 02).
17
Notes
3,7
5,6
4
3,4
MIL-M-38510/118B
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm.
3. (Four leads) φb applies between L1 and .500 (12.70 mm) from the seating plane.
4.
5.
6.
7.
8.
Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the seating plane.
Four leads.
Two holes.
Two holes located at true position within diameter .010 (.25 mm).
Leads having a maximum diameter .043 (1.09 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the seating plane shall be located at true position within diameter .014 (.36mm).
The mounting surface of the header shall be flat to convex within .003 (.08 mm) inside a .930 (23.62 mm)
diameter circle on the center of the header and flat to convex within .006 (.15 mm) overall.
FIGURE 2. Case outline Y (device type 02) – Continued.
18
MIL-M-38510/118B
Symbol
A
φb
φb1
φD
φD1
e
e1
F
k
k1
k2
L
L1
L2
α
Dimensions
Inches
Millimeters
Min
Max
Min
Max
.165
.185
4.19
4.70
.016
.019
.41
.48
.016
.021
.41
.53
Notes
3
3
.335
.305
.370
.335
8.51
7.75
9.40
8.51
.200
.100
T.P.
T.P.
5.08
2.54
T.P
T.P
5
5
--.028
.029
.050
.034
.045
--.71
.74
1.27
.86
1.14
4
.009
.041
.23
1.04
.500
---
--.050
12.70
---
--1.27
.250
---
6.35
---
45°
T.P
45°
T.P
5
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm.
3. (Three leads) φb applies between L1 and L2. φb1 applies between L2 and .500 (12.70 mm) from the reference
plane.
Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the reference plane.
4. Three leads.
5. Measured from the maximum diameter of the product.
6. Leads having a maximum diameter .019 (.48 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the base plane of the product shall be within .007 (.18 mm) of their true position
relative to a maximum width tab.
7. The product may be measured by direct methods or by gage.
FIGURE 3. Case outline X (device type 03).
19
MIL-M-38510/118B
Symbol
A
A1
φb
φD
e
e1
e2
F
φH
L
L1
R
R1
Dimensions
Inches
Millimeters
Min
Max
Min
Max
.250
.352
6.35
8.94
1.177
1.197
29.90
30.40
.038
--.655
.420
.043
.875
.675
.440
.97
--16.64
10.67
1.09
22.22
17.14
11.18
.205
.225
5.21
5.72
.060
.151
.312
---
.135
.161
.500
.050
1.52
3.84
7.92
---
3.43
4.09
12.70
1.27
.495
.131
.525
.188
12.57
3.33
13.34
4.78
Notes
3,7
5,6
4
3,4
NOTES:
1. Dimensions are in inches.
2. Metric equivalents are given for general information only and are based upon 1.00 inch = 25.4 mm.
3. (Two leads) φb applies between L1 and .500 (12.70 mm) from the seating plane.
4.
5.
6.
7.
8.
Diameter is uncontrolled in L1 and beyond .500 (12.70 mm) from the seating plane.
Two leads.
Two holes.
Two holes located at true position within diameter .010 (.25 mm).
Leads having a maximum diameter .043 (1.09 mm) measured in gaging plane .054 (1.37 mm) + .001 (.03 mm) .000 (.00 mm) below the seating plane shall be located at true position within diameter .014 (.36 mm).
The mounting surface of the header shall be flat to convex within .003 (.08 mm) inside a .930 (23.62 mm)
diameter circle on the center of the header and flat to convex within .006 (.15 mm) overall.
FIGURE 4. Case outline Y (device type 04).
20
MIL-M-38510/118B
NOTE: Case is connected to input.
FIGURE 5. Terminal connections for device types 01 and 02.
NOTES:
1.
VOUT = [((R1 + R2) / R2) x (VCONTROL) + |ICONTROL| x R2] volts.
2.
VCONTROL = -2.23 V (nominal).
3.
R2 = 446 Ω provides a minimum of |5 mA| load to the regulator at any VOUT.
FIGURE 6. Block diagram for device types 01 and 02.
21
MIL-M-38510/118B
NOTE: Case is connected to input.
FIGURE 7. Terminal connections for 03 and 04.
NOTES:
1. VOUT = [((R1 + R2) / R1) x (-1.25) + |IADJ| x R2] volts.
2.
R1 = 250 Ω.
FIGURE 8. Block diagram for device types 03 and 04.
22
MIL-M-38510/118B
Device type
R1
R2
RL
Ci, CL
01
549 Ω
Device table
02
549 Ω
03
249 Ω
04
249 Ω
442 Ω
442 Ω
0Ω
0Ω
10 Ω
5Ω
2.5 Ω
0.833 Ω
2.0 µF
2.0 µF
10.0 µF
10.0 µF
FIGURE 9. Test circuit for static tests.
23
MIL-M-38510/118B
FIGURE 9. Test circuit for static tests – Continued.
24
MIL-M-38510/118B
WAVEFORMS FOR VOLTAGE START –UP, OUTPUT SHORT CIRCUIT CURRENT,
AND OUTPUT VOLTAGE RECOVERY
FIGURE 9. Test circuit for static tests – Continued.
25
MIL-M-38510/118B
NOTES:
1. Heavy current paths (I ≥ 1.0 A) are indicated by bold lines.
2. Kelvin connections must be used for all output current and voltage measurements.
For device types 03 and 04, output voltage measurements shall be made 1/8 inch below the case.
3. The output offset voltage shall be adjusted to zero with the device under test (DUT) removed.
The operational amplifier stabilization networks may vary with test adapter construction.
Alternate drive circuits for the 2N6296 may be used to develop the proper load current and input
voltage pulses. These circuits shall require the approval of the qualifying activity.
4. Relay switch positions are defined in table III.
5. Load currents of 5 mA may be established via the load resistors R1 and R2. All other load currents
6.
7.
8.
shall be established via the pulse load circuit. Resistors R1 and R2 shall have a tolerance ≤ 0.1 %
for device types 01 and 02.
The pulse generator for the pulse load circuit shall have the following characteristics:
a. Pulse amplitude = -10 ( |IL| - VO / ( R1 + R2 )) volts.
b. Pulse width = 1.0 ms (unless otherwise stated).
c. Duty cycle = 2% (maximum).
Load currents shall be determined by the voltage measured across the 1 Ω resistor.
Measurements shall be made 0.5 ms after the start of the pulse.
|VIN| (LOW) and |VIN| (HIGH) per table III herein.
9. VRLINE = VB – VA.
10. The output voltage is sampled at specified intervals. Strobe pulse width is 100 µs maximum.
11. IL (minimum) and IL (maximum) per table III herein.
12. VRLOAD = VD – VC.
13. VRTH = VD – VE.
14. IOS = (IL) amps.
FIGURE 9. Test circuit for static tests – Continued.
26
MIL-M-38510/118B
Device type
VIN
RL
Ci, CL
01
-10 V
Device table
02
-10 V
03
-6.25 V
04
-6.25 V
40.2 Ω
14.3 Ω
10 Ω
2.5 Ω
2.0 µF
2.0 µF
1.0 µF
1.0 µF
NOTES:
1. ei = 1 Vrms at f = 2400 Hz (measured at the input terminals of the DUT).
2.
3.
4.
Ripple rejection = 20 log (eirms / eorms).
The control pin connection is required for device types 01 and 02 only.
The input 50 Ω resistor and RL shall be type RER 70 or equivalent.
The meter for ei and eo shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure
true rms voltages.
FIGURE 10. Ripple rejection test circuit.
27
MIL-M-38510/118B
Device type
VIN
RL
Ci, CL
01
10 V
Device table
02
10 V
03
6.25 V
04
6.25 V
100 Ω
50 Ω
25 Ω
12.5 Ω
2.0 µF
2.0 µF
1.0 µF
1.0 µF
NOTES:
1. The meter for measuring eorms and shall have a minimum bandwidth from 10 Hz to 10 kHz and
shall measure true rms voltages.
2. NO = eorms
3. The control pin connection is required for device types 01 and 02 only.
4. RL shall be type RER 70 or equivalent.
FIGURE 11. Noise test circuit.
28
MIL-M-38510/118B
VIN
01
-10 V
Device table
02
-10 V
03
-6.25 V
04
-6.25 V
Notes
1
∆VIN
-3.0 V
-3.0 V
-1.0 V
-1.0 V
1
1.25 kΩ
1.25 kΩ
25 Ω
12 Ω
tTHL = tTLH
5.0 µs
5.0 µs
5.0 µs
5.0 µs
Ci, CL
2.0 µF
2.0 µF
1.0 µF
1.0 µF
Device type
RL
NOTES:
1. Measured at device input.
2. Pulse width tp1 = 25 µs; duty cycle = 3% (maximum).
3. Oscilloscope bandwidth = 5 MHz to 15 MHz.
4. The control pin connection is required for device types 01 and 02 only..
FIGURE 12. Line transient test circuit.
29
1
MIL-M-38510/118B
Device type
R1
01
0
Device table
02
0
03
249 Ω
04
249 Ω
R2
5.0 kΩ
5.0 kΩ
0
0
IL
50 mA
100 mA
50 mA
100 mA
∆IL
200 mA
400 mA
200 mA
400 mA
VI
0.49 V
0.99 V
0.45 V
0.95 V
∆VI
2.0 V
4.0 V
2.0 V
4.0 V
2.0 µF
2.0 µF
1.0 µF
1.0 µF
Ci, CL
FIGURE 13. Load transient response test circuit.
30
MIL-M-38510/118B
NOTES:
1. Heavy current paths (I ≥ 1.0 A) are indicated by bold lines.
2. Kelvin connections must be used for all output current and voltage measurements.
3. The operational amplifier stabilization networks may vary with test adapter construction.
Alternate drive circuits for the 2N6296 may be used to develop the proper load current and input
voltage pulses. These circuits shall require the approval of the qualifying activity.
4. The pulse generator for the pulse load circuit shall have the following characteristics.
(See device table.)
a. Voltage level (VI) = 10 ( |IL| - (VOUT / (R1 + R2)) volts.
5.
b.
c.
d.
Pulse width (tp2) = 25 µs.
Duty cycle = 3% (maximum).
tTHL = tTLH = 1.0 µs for device types 01 and 02.
e.
tTHL = tTLH = 5.0 µs for device types 03 and 04.
f.
Difference voltage level (∆VI) = 10 (IL) volts.
a.
∆VOUT = 500 mV maximum for device type 01.
b.
∆VOUT = 1,000 mV maximum for device type 02.
∆VOUT = 60 mV maximum for device types 03 and 04.
(These values guarantee the specified limits for load transient response.)
The oscilloscope shall have a bandwidth between 5 and 15 MHz.
c.
6.
FIGURE 13. Load transient response test circuit – Continued.
31
TABLE III. Group A inspection for all device type 01.
Subgroup
1
TA =
+25°C
TA =
+125°C
Test
no.
Test conditions
VOUT1
VOUT2
VOUT3
VOUT4
1
2
3
4
VIN
(volts)
-8
-8
-30
-30
VRLINE1
VRLINE2
VRLINE2
5
6
7
-8
-8
-25
VRLOAD1
VRLOAD1
VRLOAD2
8
9
10
VRTH
IL
(mA)
5
500
5
50
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5
6-11 7-2
8-2
Relays
energized
Measurement
sense lines
Pins Value
Equation
Notes
Units
Limits
Min
-8
-8
-30
-30
--4.95
--0.45
---------
---------
---------
None
“
“
“
9-11
“
“
“
E1
E2
E3
E4
V
“
“
“
VOUT1 = E1
VOUT2 = E2
VOUT3 = E3
VOUT4 = E4
50
350
350
-8
-8
-25
0.45
3.45
3.45
-------
-------
-------
“
“
“
“
“
“
E5
E6
E7
“
“
“
VRLINE1 = E5 – E4
---
-10
-10
---
5
500
---
-10
-10
---
--4.95
---
-------
-------
-------
“
“
“
“
“
---
E8
E9
---
“
“
“
VRLOAD1 = E8 – E9
VRLOAD2 = E3 – E4
11
-15
500
-15
4.95
---
---
---
“
9-11
E10
“
VRTH = E10
ISCD1
ISCD2
12
13
-10
-30
5
5
-10
-30
-----
-----
-----
-----
“
“
12-13
“
E11
E12
“
“
∆ISCD
(LINE)
∆ISCD
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
ICTL
14
-8
5
-8
---
---
---
---
“
“
E13
“
15
-10
500
-10
4.95
---
---
---
“
“
E14
“
16
17
-10
-10
-----
-15
-15
-----
-----
-1.0
-1.0
0
0
K4,K5
K4,K5
10-5
9-11
E15
E16
18
19
-30
-30
-----
-40
-40
-----
-----
-3.5
-3.5
0
0
K5
K5
10-5
9-11
Unit
Max
-5.25 -4.75
“
“
“
“
“
“
V
“
“
“
See
figure 9
waveforms
-150
---50
150
--50
mV
“
“
See
figure 9
waveforms
---100
-150
--100
150
“
“
“
See figure 9
waveforms
-50
50
“
ISCD1 = E11 / 2000
ISCD2 = E12 / 2000
0.1
0.1
3.0
4.0
mA
“
-1.0
1.0
“
-0.5
0.5
“
“
“
∆ISCD = E13 – E12 / 2000
(LINE)
∆ISCD = E11 – E14 / 2000
(LOAD)
IOS1 = E15
VOUT5 = E16
E17
E18
“
“
IOS2 = E17
VOUT6 = E18
VRLINE2 = E6 – E7
---
20
-10
350
-10
3.45
---
---
---
K1,K2
12-13
E19
“
ICTL = E19 / 33200
VSTART
21
-8
500
-15
---
---
-0.8
---
K4
9-11
E20
“
VOUT = E20
VOUT7
22
-38
500
-38
4.95
---
---
---
None
“
E21
“
VOUT = E21
VOUT1
VOUT2
VOUT3
VOUT4
23
24
25
26
-8
-8
-30
-30
5
500
5
50
-8
-8
-30
-30
--4.95
--0.45
---------
---------
---------
None
“
“
“
9-11
“
“
“
E22
E23
E24
E25
V
“
“
“
VOUT1 = E22
VOUT2 = E23
VOUT3 = E24
VOUT4 = E25
VRLINE1
VRLINE2
VRLINE2
27
28
29
-8
-8
-25
50
350
350
-8
-8
-25
0.45
3.45
3.45
-------
-------
-------
“
“
“
“
“
“
E26
E27
E28
“
“
“
VRLINE1 = E26 – E25
---
VRLOAD1
VRLOAD1
VRLOAD2
30
31
32
-10
-10
---
5
500
---
-10
-10
---
--4.95
---
-------
-------
-------
“
“
“
“
“
---
E29
E30
---
“
“
“
VRLOAD1 = E29 – E30
VRLOAD2 = E24 – E25
ISCD1
ISCD2
33
34
-10
-30
5
5
-10
-30
-----
-----
-----
-----
“
“
12-13
“
E31
E32
“
“
ISCD1 = E31 / 2000
ISCD2 = E32 / 2000
VRLINE2 = E27 – E28
---
See figure 9
waveforms
0.002 2.0
-5.25 -4.75
A
V
0.002 1.0
-5.25 -4.75
A
V
0.001
µA
V
2
See figure 9 -5.25 -4.75
waveforms
R1 = 5.49 kΩ -31.5 -28.5
±0.1%
-5.25 -4.75
“
“
“
“
“
“
V
V
“
“
“
See
figure 9
waveforms
-150
---50
150
--50
mV
“
“
See
figure 9
waveforms
---100
-150
--100
150
“
“
“
0.1
0.1
3.0
4.0
mA
“
MIL-M-38510/118B
32
2
Symbol
TABLE III. Group A inspection for all device type 01 – Continued.
Subgroup
2
TA =
+125°C
TA = +150°C
3
TA =
-55°C
Symbol
Test
no.
Test conditions
∆ISCD
(LINE)
∆ISCD
(LOAD)
35
VIN
(volts)
-8
36
-10
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
ICTL
37
38
VSTART
VOUT7
IL
(mA)
5
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5 6-11 7-2
8-2
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
Notes
∆ISCD = E33 – E32 / 2000
(LINE)
∆ISCD = E31 – E34 / 2000
(LOAD)
Unit
Limits
Min
Max
-1.0
1.0
mA
-0.5
0.5
“
0.002
-5.25
2.0
-4.75
A
V
0.002
-5.25
1.0
-4.75
A
V
0.001
3
-5.25
-4.75
µA
V
-31.5
-28.5
V
---
---
---
---
None
12-13
E33
V
500
-10
4.95
---
---
---
“
“
E34
“
-10
-10
-----
-15
-15
-----
-----
-1.0
-1.0
0
0
K4,K5
K4,K5
10-5
9-11
E35
E36
“
“
IOS1 = E35
VOUT5 = E36
39
40
-30
-30
-----
-40
-40
-----
-----
-3.5
-3.5
0
0
K5
K5
10-5
9-11
E37
E38
“
“
IOS2 = E37
VOUT6 = E38
41
-10
350
-10
3.45
---
---
---
K1,K2
12-13
E39
“
ICTL = E39 / 33200
42
-8
500
-15
---
---
-0.8
---
K4
9-11
E40
“
VOUT = E40
43
-38
500
-38
4.95
---
---
---
None
“
E41
“
VOUT7 = E41
VOUT8
44
-10
5
-10
---
---
---
---
“
“
E42
“
VOUT8 = E42
-5.30
-4.70
“
VOUT1
VOUT2
VOUT3
VOUT4
45
46
47
48
-8
-8
-30
-30
5
500
5
50
-8
-8
-30
-30
--4.95
--0.45
---------
---------
---------
None
“
“
“
9-11
“
“
“
E43
E44
E45
E46
V
“
“
“
VOUT1 = E43
VOUT2 = E44
VOUT3 = E45
VOUT4 = E46
-5.25
“
“
“
-4.75
“
“
“
V
“
“
“
VRLINE1
VRLINE2
VRLINE2
49
50
51
-8
-8
-25
50
350
350
-8
-8
-25
0.45
3.45
3.45
-------
-------
-------
“
“
“
“
“
“
E47
E48
E49
“
“
“
VRLINE1 = E47 – E46
---
See
figure 9
waveforms
-150
---50
150
--50
mV
“
“
VRLOAD1
VRLOAD1
VRLOAD2
52
53
54
-10
-10
---
5
500
---
-10
-10
---
--4.95
---
-------
-------
-------
“
“
“
“
“
---
E50
E51
---
“
“
“
VRLOAD1 = E50 – E51
VRLOAD2 = E45 – E46
See
figure 9
waveforms
---100
-150
--100
150
“
“
“
ISCD1
ISCD2
55
56
-10
-30
5
5
-10
-30
-----
-----
-----
-----
“
“
12-13
“
E52
E53
“
“
ISCD1 = E52 / 2000
ISCD2 = E53 / 2000
0.1
0.1
3.0
4.0
mA
“
∆ISCD
(LINE)
∆ISCD
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
ICTL
57
-8
5
-8
---
---
---
---
None
12-13
E54
V
-1.0
1.0
mA
58
-10
500
-10
4.95
---
---
---
“
“
E55
“
-0.5
0.5
“
59
60
-10
-10
-----
-15
-15
-----
-----
-1.0
-1.0
0
0
K4,K5
K4,K5
10-5
9-11
E56
E57
“
“
∆ISCD = E54 – E53 / 2000
(LINE)
∆ISCD = E52 – E55 / 2000
(LOAD)
IOS1 = E56
VOUT5 = E57
0.002
-5.25
2.0
-4.75
A
V
61
62
-30
-30
-----
-40
-40
-----
-----
-3.5
-3.5
0
0
K5
K5
10-5
9-11
E58
E59
“
“
IOS2 = E58
VOUT6 = E59
0.002
-5.25
1.0
-4.75
A
V
0.001
3
-5.25
-4.75
µA
V
-31.5
-28.5
V
VRLINE2 = E48 – E49
---
63
-10
350
-10
3.45
---
---
---
K1,K2
12-13
E60
“
ICTL = E60 / 33200
VSTART
64
-8
500
-15
---
---
-0.8
---
K4
9-11
E61
“
VOUT = E61
VOUT7
65
-38
500
-38
4.95
---
---
---
None
“
E62
“
VOUT = E62
See figure 9
waveforms
See figure 9
waveforms
R1 = 5.49 kΩ
±0.1%
See figure 9
waveforms
See figure 9
waveforms
R1 = 5.49 kΩ
±0.1%
MIL-M-38510/118B
33
-8
TABLE III. Group A inspection for all device type 01 – Continued.
Subgroup
Symbol
Test
no.
Test conditions
Input voltage
VIN = -10 V
Measurement
sense lines
Equation
Symbol
Value
Units
Load current
IL = 125 mA
eorms
E63
Vrms
∆VIN / ∆VOUT = -20 log E63
VNO = E64
4
∆VIN /
TA =
+25°C
7
∆VOUT
VNO
67
VIN = -10 V
IL = 50 mA
eorms
E64
Vrms
TA =
∆VOUT /
68
VIN = -10 V
IL = 5 mA
VOUT
E65
V
∆VOUT / ∆VIN = E65 / 3
+25°C
∆VIN
IL = 50 mA
VOUT
E66
V
∆VOUT / ∆IL = E66 / 200
∆VOUT /
∆IL
66
Notes
Unit
Limits
Min
Max
See figure
10
45
---
dB
See figure
11
See figure
12
---
250
µVrms
---
30
mV/V
---
2.5
mV/mA
ei = 1.0 Vrms
at 2400 Hz
Vpulse = -3.0 V
69
VIN = -10 V
See figure
13
∆IL = 200 mA
MIL-M-38510/118B
34
TABLE III. Group A inspection for all device type 02.
Subgroup
1
TA =
+25°C
TA =
+125°C
Test
no.
Test conditions
VOUT1
VOUT2
VOUT3
VOUT4
1
2
3
4
VIN
(volts)
-8
-8
-30
-30
VRLINE1
VRLINE2
VRLINE2
5
6
7
-8
-8
-25
VRLOAD1
VRLOAD1
VRLOAD2
8
9
10
VRTH
IL
(mA)
5
1000
5
100
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5
6-11 7-2
8-2
Relays
energized
Measurement
sense lines
Pins Value
Equation
Notes
Units
Min
-8
-8
-30
-30
--9.95
--0.95
---------
---------
---------
None
“
“
“
9-11
“
“
“
E1
E2
E3
E4
V
100
500
500
-8
-8
-25
0.95
4.95
4.95
-------
-------
-------
“
“
“
“
“
“
E5
E6
E7
“
“
“
-10
-10
---
5
1000
---
-10
-10
---
--9.95
---
-------
-------
-------
“
“
“
“
“
---
E8
E9
---
“
“
“
VRLOAD1 = E8 – E9
VRLOAD2 = E3 – E4
11
-15
1000
-15
9.95
---
---
---
“
9-11
E10
“
VRTH = E10
ISCD1
ISCD2
12
13
-10
-30
5
5
-10
-30
-----
-----
-----
-----
“
“
12-13
“
E11
E12
“
“
∆ISCD
(LINE)
∆ISCD
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
ICTL
14
-8
5
-8
---
---
---
---
“
“
E13
“
15
-10
1000
-10
9.95
---
---
---
“
“
E14
“
16
17
-10
-10
-----
-15
-15
-----
-----
-1.0
-1.0
0
0
K4,K5
K4,K5
10-5
9-11
E15
E16
18
19
-30
-30
-----
-40
-40
-----
-----
-3.5
-3.5
0
0
K5
K5
10-5
9-11
“
“
“
Limits
Max
-5.25 -4.75
“
“
“
“
“
“
VOUT1 = E1
VOUT2 = E2
VOUT3 = E3
VOUT4 = E4
Unit
V
“
“
“
See
figure 9
waveforms
-150
---50
150
--50
mV
“
“
See
figure 9
waveforms
---100
-150
--100
150
“
“
“
See figure 9
waveforms
-50
50
“
ISCD1 = E11 / 2000
ISCD2 = E12 / 2000
0.1
0.1
3.0
4.0
mA
“
-1.0
1.0
“
-0.5
0.5
“
“
“
∆ISCD = E13 – E12 / 2000
(LINE)
∆ISCD = E11 – E14 / 2000
(LOAD)
IOS1 = E15
VOUT5 = E16
E17
E18
“
“
IOS2 = E17
VOUT6 = E18
E19
“
ICTL = E19 / 33200
VRLINE1 = E5 – E4
--VRLINE2 = E6 – E7
---
20
-10
500
-10
4.95
---
---
---
K1,K2
12-13
VSTART
21
-8
1000
-15
---
---
-0.8
---
K4
9-11
E20
“
VOUT = E20
VOUT7
22
-38
1000
-38
---
---
---
---
None
“
E21
“
VOUT7 = E21
VOUT1
VOUT2
VOUT3
VOUT4
23
24
25
26
-8
-8
-30
-30
5
1000
5
100
-8
-8
-30
-30
--9.95
--0.95
---------
---------
---------
None
“
“
“
9-11
“
“
“
E22
E23
E24
E25
V
“
“
“
VOUT1 = E22
VOUT2 = E23
VOUT3 = E24
VOUT4 = E25
VRLINE1
VRLINE2
VRLINE2
27
28
29
-8
-8
-25
100
500
500
-8
-8
-25
0.95
4.95
4.95
-------
-------
-------
“
“
“
“
“
“
E26
E27
E28
“
“
“
VRLINE1 = E26 – E25
---
VRLOAD1
VRLOAD1
VRLOAD2
30
31
32
-10
-10
---
5
1000
---
-10
-10
---
--9.95
---
-------
-------
-------
“
“
“
“
“
---
E29
E30
---
“
“
“
VRLOAD1 = E29 – E30
VRLOAD2 = E24 – E25
ISCD1
ISCD2
33
34
-10
-30
5
5
-10
-30
-----
-----
-----
-----
“
“
12-13
“
E31
E32
“
“
ISCD1 = E31 / 2000
ISCD2 = E32 / 2000
VRLINE2 = E27 – E28
---
See figure 9
waveforms
0.002 4.5
-5.25 -4.75
A
V
0.002 2.0
-5.25 -4.75
A
V
0.01
µA
V
2
See figure 9 -5.25 -4.75
waveforms
R1 = 5.49 kΩ -31.5 -28.5
±0.1%
-5.25 -4.75
“
“
“
“
“
“
V
V
“
“
“
See
figure 9
waveforms
-150
---50
150
--50
mV
“
“
See
figure 9
waveforms
---100
-150
--100
150
“
“
“
0.1
0.1
3.0
4.0
mA
“
MIL-M-38510/118B
35
2
Symbol
TABLE III. Group A inspection for all device type 02 – Continued.
Subgroup
2
TA =
+125°C
TA = +150°C
3
TA =
-55°C
Symbol
Test
no.
Test conditions
∆ISCD
(LINE)
∆ISCD
(LOAD)
35
VIN
(volts)
-8
36
-10
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
ICTL
37
38
VSTART
VOUT7
IL
(mA)
5
See figure 9
Applied test voltages
(volts) (Hi - Lo pin potential)
1-2
4-5 6-11 7-2
8-2
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
Notes
∆ISCD = E33 – E32 / 2000
(LINE)
∆ISCD = E31 – E34 / 2000
(LOAD)
Limits
Unit
Min
Max
-1.0
1.0
mA
-0.5
0.5
“
0.002
-5.25
4.5
-4.75
A
V
0.002
-5.25
2.0
-4.75
A
V
0.001
3
-5.25
-4.75
µA
V
-31.5
-28.5
V
---
---
---
---
None
12-13
E33
V
1000
-10
9.95
---
---
---
“
“
E34
“
-10
-10
-----
-15
-15
-----
-----
-1.0
-1.0
0
0
K4,K5
K4,K5
10-5
9-11
E35
E36
“
“
IOS1 = E35
VOUT5 = E36
39
40
-30
-30
-----
-40
-40
-----
-----
-3.5
-3.5
0
0
K5
K5
10-5
9-11
E37
E38
“
“
IOS2 = E37
VOUT6 = E38
41
-10
500
-10
4.95
---
---
---
K1,K2
12-13
E39
“
ICTL = E39 / 33200
42
-8
1000
-15
---
---
-0.8
---
K4
9-11
E40
“
VOUT = E40
43
-38
1000
-38
---
---
---
---
None
“
E41
“
VOUT7 = E41
VOUT8
44
-10
5
-10
---
---
---
---
“
“
E42
“
VOUT8 = E42
-5.30
-4.70
“
VOUT1
VOUT2
VOUT3
VOUT4
45
46
47
48
-8
-8
-30
-30
5
1000
5
100
-8
-8
-30
-30
--9.95
--0.95
---------
---------
---------
None
“
“
“
9-11
“
“
“
E43
E44
E45
E46
V
“
“
“
VOUT1 = E43
VOUT2 = E44
VOUT3 = E45
VOUT4 = E46
-5.25
“
“
“
-4.75
“
“
“
V
“
“
“
VRLINE1
VRLINE2
VRLINE2
49
50
51
-8
-8
-25
100
500
500
-8
-8
-25
0.95
4.95
4.95
-------
-------
-------
“
“
“
“
“
“
E47
E48
E49
“
“
“
VRLINE1 = E47 – E46
---
See
figure 9
waveforms
-150
---50
150
--50
mV
“
“
VRLOAD1
VRLOAD1
VRLOAD2
52
53
54
-10
-10
---
5
1000
---
-10
-10
---
--9.95
---
-------
-------
-------
“
“
“
“
“
---
E50
E51
---
“
“
“
VRLOAD1 = E50 – E51
VRLOAD2 = E45 – E46
See
figure 9
waveforms
---100
-150
--100
150
“
“
“
ISCD1
ISCD2
55
56
-10
-30
5
5
-10
-30
-----
-----
-----
-----
“
“
12-13
“
E52
E53
“
“
ISCD1 = E52 / 2000
ISCD2 = E53 / 2000
0.1
0.1
3.0
4.0
mA
“
∆ISCD
(LINE)
∆ISCD
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
ICTL
57
-8
5
-8
---
---
---
---
None
12-13
E54
V
-1.0
1.0
mA
58
-10
1000
-10
9.95
---
---
---
“
“
E55
“
-0.5
0.5
“
59
60
-10
-10
-----
-15
-15
-----
-----
-1.0
-1.0
0
0
K4,K5
K4,K5
10-5
9-11
E56
E57
“
“
∆ISCD = E54 – E53 / 2000
(LINE)
∆ISCD = E52 – E55 / 2000
(LOAD)
IOS1 = E56
VOUT5 = E57
0.002
-5.25
4.5
-4.75
A
V
61
62
-30
-30
-----
-40
-40
-----
-----
-3.5
-3.5
0
0
K5
K5
10-5
9-11
E58
E59
“
“
IOS2 = E58
VOUT6 = E59
0.002
-5.25
2.0
-4.75
A
V
0.001
3
-5.25
-4.75
µA
V
-31.5
-28.5
V
VRLINE2 = E48 – E49
---
63
-10
500
-10
4.95
---
---
---
K1,K2
12-13
E60
“
ICTL = E60 / 33200
VSTART
64
-8
1000
-15
---
---
-0.8
---
K4
9-11
E61
“
VOUT = E61
VOUT7
65
-38
1000
-38
---
---
---
---
None
“
E62
“
VOUT7 = E62
See figure 9
waveforms
See figure 9
waveforms
R1 = 5.49 kΩ
±0.1%
See figure 9
waveforms
See figure 9
waveforms
R1 = 5.49 kΩ
±0.1%
MIL-M-38510/118B
36
-8
TABLE III. Group A inspection for all device type 02 – Continued.
Subgroup
Symbol
Test
no.
Test conditions
Input voltage
VIN = -10 V
Measurement
sense lines
Equation
Symbol
Value
Units
Load current
IL = 350 mA
eorms
E63
Vrms
∆VIN / ∆VOUT = -20 log E63
VNO = E64
4
∆VIN /
TA =
+25°C
7
∆VOUT
VNO
67
VIN = -10 V
IL = 100 mA
eorms
E64
Vrms
TA =
∆VOUT /
68
VIN = -10 V
IL = 5 mA
VOUT
E65
V
∆VOUT / ∆VIN = E65 / 3
IL = 100 mA
VOUT
E66
V
∆VOUT / ∆IL = E66 / 400
+25°C
66
Unit
Min
Max
See figure
10
45
---
dB
See figure
11
See figure
12
---
250
µVrms
---
30
mV/V
---
2.5
mV/mA
Vpulse = -3.0 V
69
VIN = -10 V
∆IL = 400 mA
See figure
13
37
MIL-M-38510/118
∆IL
Limits
ei = 1.0 Vrms
at 2400 Hz
∆VIN
∆VOUT /
Notes
TABLE III. Group A inspection for all device type 03.
Subgroup
1
TA =
+25°C
TA =
+125°C
Test
no.
Test conditions
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5 6-11
7-2
8-2
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
None
“
“
“
9-11
“
“
“
E1
E2
E3
E4
---
V
“
“
“
VOUT1 = E1
VOUT2 = E2
VOUT3 = E3
VOUT4 = E4
“
VRLINE = E1 – E3
VRLOAD1 = E5 – E6
VRLOAD2 = E3 – E4
VRLOAD3 = E5 – E7
Notes
Lines
Unit
Min
Max
-1.275
“
“
“
-1.225
“
“
“
V
“
“
“
-9
9
mV
---12
-6
-6
--12
6
6
“
“
“
“
-5
5
“
VOUT1
VOUT2
VOUT3
VOUT4
1
2
3
4
VIN
(volts)
-4.25
-4.25
-41.25
-41.25
VRLINE1
5
---
---
---
---
---
---
---
“
“
VRLOAD1
VRLOAD1
VRLOAD2
VRLOAD3
6
7
8
9
-6.25
-6.25
---6.25
5
500
--200
-6.25
-6.25
---6.25
0
4.95
--1.95
---------
---------
---------
“
“
“
“
“
“
“
“
E5
E6
E7
“
“
“
“
VRTH
10
-14.6
500
-14.6
7.45
---
---
---
“
“
E8
“
VRTH = E8
IADJ
IADJ
11
12
-4.25
-41.25
5
5
-4.25
-41.25
0
0
-----
-----
-----
K2
“
12-13
“
mV
“
IADJ = E9 / 2000
IADJ = E10 / 2000
25
25
100
100
µA
“
∆IADJ
(LINE)
∆IADJ
(LOAD)
13
---
---
---
---
---
---
---
“
“
E9
E10
---
“
∆IADJ = (E9 – E10) / 2000
(LINE)
-5
5
“
14
-6.25
5
-6.25
0
---
---
---
“
“
E11
“
5
“
15
-6.25
500
-6.25
4.95
---
---
---
“
“
E12
“
∆IADJ = (E11 – E12) / 2000
(LINE)
-5
∆IADJ
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
IQ1
16
17
-4.25
-4.25
-----
-10
-10
-----
-----
-0.425
-0.425
0
0
K4,K5
K4,K5
10-5
9-11
E13
E14
V
“
0.05
-1.275
1.8
-1.225
A
V
18
19
-40
-40
-----
-40
-40
-----
-----
-----
0
0
K5
K5
10-5
9-11
E15
E16
“
“
0.05
-1.275
0.5
-1.225
A
V
IL
(mA)
5
500
5
50
-4.25
-4.25
-41.25
-41.25
--4.95
--0.45
---------
---------
---------
---
See figure 9
waveforms
See
figure 9
waveforms
See figure 9
waveforms
See figure 9
waveforms
20
-4.25
---
-4.25
0
-1.4
---
---
K3
12-13
E17
“
IOS1 = E13
VOUT5 = E14
(RECOV)
IOS2 = E15
VOUT6 = E16
(RECOV)
IQ1 = E17 / 2000
0.2
3.0
mA
IQ2
21
-14.25
---
-14.25
0
-1.4
---
---
K3
12-13
E18
“
IQ2 = E18 / 2000
0.2
3.0
“
IQ3
22
-41.25
---
-41.25
0
-1.4
---
---
K3
12-13
E19
“
IQ3 = E19 / 2000
1.0
5.0
“
VSTART
23
-4.25
500
-10
0
---
-0.425
---
K4
9-11
E20
“
VSTART = E20
-1.275
-1.225
V
VOUT1
VOUT2
VOUT3
VOUT4
24
25
26
27
-4.25
-4.25
-41.25
-41.25
5
500
5
50
-4.25
-4.25
-41.25
-41.25
--4.95
--0.45
---------
---------
---------
None
“
“
“
9-11
“
“
“
V
“
“
“
VOUT1 = E21
VOUT2 = E22
VOUT3 = E23
VOUT4 = E24
-1.30
“
“
“
-1.20
“
“
“
V
“
“
“
VRLINE1
28
---
---
---
---
---
---
---
“
“
E21
E22
E23
E24
---
“
VRLINE = E21 – E23
-23
23
mV
VRLOAD1
VRLOAD1
VRLOAD2
VRLOAD3
29
30
31
32
-6.25
-6.25
---6.25
5
500
--200
-6.25
-6.25
---6.25
0
4.95
--1.95
---------
---------
---------
“
“
“
“
“
“
“
“
E25
E26
---
“
“
“
“
VRLOAD1 = E25 – E26
VRLOAD2 = E23 – E24
VRLOAD3 = E25 – E27
---24
-12
-12
--24
12
12
“
“
“
“
E27
---
See figure 9
waveforms
See figure 9
waveforms
See
figure 9
waveforms
MIL-M-38510/118B
38
2
Symbol
TABLE III. Group A inspection for all device type 03 – Continued.
Subgroup
Symbol
Test
no.
Test conditions
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5 6-11
7-2
8-2
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
K2
“
12-13
“
mV
“
“
IADJ
IADJ
33
34
TA =
+125°C
∆IADJ
(LINE)
35
---
---
---
---
---
---
---
“
“
E28
E29
---
∆IADJ
(LOAD)
36
-6.25
5
-6.25
0
---
---
---
“
“
E30
“
∆IADJ
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
IQ1
IQ2
IQ3
37
-6.25
500
-6.25
4.95
---
---
---
“
“
E31
“
38
39
-4.25
-4.25
-----
-10
-10
-----
-----
-0.425
-0.425
0
0
K4,K5
K4,K5
10-5
9-11
E32
E33
V
“
40
41
-40
-40
-----
-40
-40
-----
-----
-----
0
0
K5
K5
10-5
9-11
E34
E35
“
“
42
43
44
-4.25
-14.25
-41.25
-------
-4.25
-14.25
-41.25
0
0
0
-1.4
-1.4
-1.4
-------
-------
K3
K3
K3
12-13
12-13
12-13
E36
E37
E38
VSTART
45
-4.25
500
-10
0
---
-0.425
---
K4
9-11
VOUT7
46
-6.25
5
-6.25
0
---
---
---
None
VOUT1
VOUT2
VOUT3
VOUT4
47
48
49
50
-4.25
-4.25
-41.25
-41.25
5
500
5
50
-4.25
-4.25
-41.25
-41.25
0
4.95
0
0.45
---------
---------
---------
VRLINE1
51
---
---
---
---
---
---
VRLOAD1
VRLOAD1
VRLOAD2
VRLOAD3
52
53
54
55
-6.25
-6.25
---6.25
5
500
--200
-6.25
-6.25
---6.25
0
4.95
--1.95
---------
IADJ
IADJ
56
57
-4.25
-41.25
5
5
-4.25
-41.25
0
0
∆IADJ
(LINE)
∆IADJ
(LOAD)
58
---
---
---
59
-6.25
5
∆IADJ
(LOAD)
60
-6.25
500
TA =
+150°C
3
TA =
-55°C
IL
(mA)
5
5
-4.25
-41.25
0
0
-----
-----
-----
Limits
Unit
Min
Max
IADJ = E28 / 2000
IADJ = E29 / 2000
25
25
100
100
µA
“
∆IADJ = (E28 – E29) / 2000
(LINE)
-5
5
“
∆IADJ = (E30 – E31) / 2000
(LINE)
-5
5
“
0.5
-1.30
1.8
-1.20
A
V
0.05
-1.30
0.5
-1.20
A
V
0.2
0.2
1.0
3.0
3.0
5.0
mA
“
“
-1.30
-1.20
V
See figure 9
waveforms
“
“
“
IOS1 = E32
VOUT5 = E33
(RECOV)
IOS2 = E34
VOUT6 = E35
(RECOV)
IQ1 = E36 / 2000
IQ2 = E37 / 2000
IQ3 = E38 / 2000
E39
“
VSTART = E39
See figure 9
waveforms
“
E40
“
VOUT7 = E40
-1.30
-1.20
V
None
“
“
“
9-11
“
“
“
V
“
“
“
VOUT1 = E41
VOUT2 = E42
VOUT3 = E43
VOUT4 = E44
-1.30
“
“
“
-1.20
“
“
“
V
“
“
“
---
“
“
E41
E42
E43
E44
---
“
VRLINE = E41 – E43
-23
23
mV
---------
---------
“
“
“
“
“
“
“
“
E45
E46
E47
E48
“
“
“
“
VRLOAD1 = E45 – E46
VRLOAD2 = E43 – E44
VRLOAD3 = E45 – E48
---24
-12
-12
--24
12
12
“
“
“
“
-----
-----
-----
K2
“
12-13
“
mV
“
IADJ = E49 / 2000
IADJ = E50 / 2000
25
25
100
100
µA
“
---
---
---
---
“
“
E49
E50
---
“
∆IADJ = (E49 – E50) / 2000
(LINE)
-5
5
“
-6.25
0
---
---
---
“
“
E51
“
5
“
4.95
---
---
---
“
“
E52
“
∆IADJ = (E51 – E52) / 2000
(LINE)
-5
-6.25
---
See figure 9
waveforms
See
figure 9
waveforms
MIL-M-38510/118B
39
2
VIN
(volts)
-4.25
-41.25
Notes
TABLE III. Group A inspection for all device type 03 – Continued.
Subgroup
3
TA =
-55°C
Test
no.
Test conditions
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5 6-11
7-2
8-2
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
K4,K5
10-5
E53
V
IOS1 = E53
IOS1
61
VIN
(volts)
-4.25
VOUT5
(RECOV)
62
-4.25
---
-10
---
---
-0.425
0
K4,K5
9-11
E54
“
VOUT5 = E54
(RECOV)
IOS2
VOUT6
(RECOV)
IQ1
IQ2
IQ3
63
64
-40
-40
-----
-40
-40
-----
-----
-----
0
0
K5
K5
10-5
9-11
E55
E56
“
“
65
66
67
-4.25
-14.25
-41.25
-------
-4.25
-14.25
-41.25
0
0
0
-1.4
-1.4
-1.4
-------
-------
K3
K3
K3
12-13
12-13
12-13
E57
E58
E59
“
“
“
IOS2 = E55
VOUT6 = E56
(RECOV)
IQ1 = E57 / 2000
IQ2 = E58 / 2000
IQ3 = E59 / 2000
VSTART
68
-4.25
500
-10
0
---
-0.425
---
K4
9-11
E60
“
VSTART = E60
See figure
9
waveforms
Symbol
Test
no.
Equation
Notes
IL
(mA)
---
-10
---
---
-0.425
0
Test conditions
Measurement
sense lines
Symbol Value
Input voltage
VIN = -6.25 V
eorms
E61
Vrms
∆VIN / ∆VOUT = -20 log E61
VNO = E62
40
∆VIN /
TA =
+25°C
7
∆VOUT
VNO
70
VIN = -6.25 V
IL = 50 mA
eorms
E62
Vrms
TA =
∆VOUT /
71
VIN = -6.25 V
IL = 50 mA
VOUT
E63
V
∆VOUT / ∆VIN = E59 / 1
IL = 50 mA
VOUT
E64
V
∆VOUT / ∆IL = E64 / 200
69
∆IL
Limits
Unit
Min
Max
0.5
1.8
A
-1.30
-1.20
V
0.05
-1.30
0.5
-1.20
A
V
0.2
0.2
1.0
3.0
3.0
5.0
mA
“
“
-1.30
-1.20
V
Unit
Limits
Min
Max
See figure
10
48
---
dB
See figure
11
See figure
12
---
120
µVrms
---
80
mV/V
See figure
13
---
0.30
mV/mA
ei = 1.0 Vrms
at 2400 Hz
∆VIN
∆VOUT /
See figure
9
waveforms
Units
Load current
IL = 125 mA
4
+25°C
Notes
Vpulse = -1.0 V
72
VIN = -6.25 V
∆IL = 200 mA
MIL-M-38510/118B
Subgroup
Symbol
TABLE III. Group A inspection for all device type 04.
Subgroup
1
TA =
+25°C
TA =
+125°C
Test
no.
Test conditions
See figure 9
Applied test voltages
(volts) (Hi – LO pin potential)
1-2
4-5 6-11
7-2
8-2
VOUT1
VOUT2
VOUT3
VOUT4
1
2
3
4
VIN
(volts)
-4.25
-4.25
-41.25
-41.25
VRLINE1
5
---
---
---
VRLOAD1
VRLOAD1
VRLOAD2
6
7
8
-6.25
-6.25
---
5
1500
---
VRTH
9
-14.6
1500
IADJ
10
-4.25
IADJ
11
-41.25
∆IADJ
(LINE)
∆IADJ
(LOAD)
12
∆IADJ
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
IQ1
IQ2
IQ3
IL
(mA)
5
1500
5
200
-4.25
---4.25 14.95
-41.25
---41.25 1.95
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
V
“
“
“
VOUT1 = E1
VOUT2 = E2
VOUT3 = E3
VOUT4 = E4
“
VRLINE = E1 – E3
Notes
Limits
Unit
Min
Max
-1.275
“
“
“
-1.225
“
“
“
V
“
“
“
-9
9
mV
---6
-6
--6
6
“
“
“
-5
5
“
---------
---------
---------
None
“
“
“
9-11
“
“
“
---
---
---
---
“
“
E1
E2
E3
E4
---
-6.25
-6.25
---
0
14.95
---
-------
-------
-------
“
“
“
“
“
“
E5
E6
---
“
“
“
VRLOAD1 = E5 – E6
VRLOAD2 = E3 – E4
-14.6
14.95
---
---
---
“
“
E7
“
VRTH = E7
5
-4.25
0
---
---
---
K2
12-13
E8
mV
IADJ = E8 / 2000
25
100
5
-41.25
0
---
---
---
“
“
“
IADJ = E9 / 2000
25
100
µA
“
---
---
---
---
---
---
---
“
“
E9
---
“
∆IADJ = (E8 – E9) / 2000
(LINE)
-5
5
“
13
-6.25
5
-6.25
0
---
---
---
“
“
E10
“
5
“
-6.25
1500
-6.25
14.95
---
---
---
“
“
E11
“
∆IADJ = (E10 – E11) / 2000
(LINE)
-5
14
15
16
-4.25
-4.25
-----
-10
-10
-----
-----
-0.425
-0.425
0
0
K4,K5
K4,K5
10-5
9-11
E12
E13
V
“
1.5
-1.275
3.5
-1.225
A
V
17
18
-40
-40
-----
-40
-40
-----
-----
-----
0
0
K5
K5
10-5
9-11
E14
E15
“
“
0.2
-1.275
1.0
-1.225
A
V
19
20
21
-4.25
-14.25
-41.25
-------
-4.25
-14.25
-41.25
0
0
0
-1.4
-1.4
-1.4
-------
-------
K3
K3
K3
12-13
12-13
12-13
E16
E17
E18
0.2
0.2
1.0
3.0
3.0
5.0
mA
“
“
VSTART
22
-4.25
1500
-10
0
---
-0.425
---
K4
9-11
-1.275
-1.225
V
VOUT1
VOUT2
VOUT3
VOUT4
23
24
25
26
-4.25
-4.25
-41.25
-41.25
5
1500
5
200
---------
---------
---------
None
“
“
“
9-11
“
“
“
-1.30
“
“
“
-1.20
“
“
“
V
“
“
“
VRLINE1
27
---
---
---
---
---
---
---
“
“
-23
23
mV
VRLOAD1
VRLOAD1
VRLOAD2
28
29
30
-6.25
-6.25
---
5
1500
---
-6.25
-6.25
---
0
14.95
---
-------
-------
-------
“
“
“
“
“
“
---12
-12
--12
12
“
“
“
-4.25
0
-4.25 14.95
-41.25
0
-41.25 1.95
---
See figure 9
waveforms
See
figure 9
waveforms
See figure 9
waveforms
See figure 9
waveforms
“
“
“
IOS1 = E12
VOUT5 = E13
(RECOV)
IOS2 = E14
VOUT6 = E15
(RECOV)
IQ1 = E16 / 2000
IQ2 = E17 / 2000
IQ3 = E18 / 2000
E19
“
VSTART = E19
See figure 9
waveforms
E20
E21
E22
E23
---
V
“
“
“
VOUT1 = E20
VOUT2 = E21
VOUT3 = E22
VOUT4 = E23
“
VRLINE = E20 – E22
E24
E25
“
“
“
VRLOAD1 = E24 – E25
VRLOAD2 = E22 – E23
---
See figure 9
waveforms
See
figure 9
waveforms
MIL-M-38510/118B
41
2
Symbol
TABLE III. Group A inspection for all device type 04 – Continued.
Subgroup
Symbol
Test
no.
Test conditions
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5 6-11
7-2
8-2
Relays
energized
Measurement
sense lines
Equation
Pins
Value
Units
K2
“
12-13
“
mV
“
“
IADJ
IADJ
31
32
TA =
+125°C
∆IADJ
(LINE)
33
---
---
---
---
---
---
---
“
“
E26
E27
---
∆IADJ
(LOAD)
34
-6.25
5
-6.25
0
---
---
---
“
“
E28
“
∆IADJ
(LOAD)
IOS1
VOUT5
(RECOV)
IOS2
VOUT6
(RECOV)
IQ1
IQ2
IQ3
35
-6.25
1500
-6.25
14.95
---
---
---
“
“
E29
“
36
37
-4.25
-4.25
-----
-10
-10
-----
-----
-0.425
-0.425
0
0
K4,K5
K4,K5
10-5
9-11
E30
E31
V
“
38
39
-40
-40
-----
-40
-40
-----
-----
-----
0
0
K5
K5
10-5
9-11
E32
E33
“
“
40
41
42
-4.25
-14.25
-41.25
-------
-4.25
-14.25
-41.25
0
0
0
-1.4
-1.4
-1.4
-------
-------
K3
K3
K3
12-13
12-13
12-13
E34
E35
E36
VSTART
43
-4.25
1500
-10
0
---
-0.425
---
K4
9-11
VOUT7
44
-6.25
5
-6.25
0
---
---
---
None
VOUT1
VOUT2
VOUT3
VOUT4
45
46
47
48
-4.25
-4.25
-41.25
-41.25
5
1500
5
200
---------
---------
---------
VRLINE1
49
---
---
---
---
---
---
VRLOAD1
VRLOAD1
VRLOAD2
50
51
52
-6.25
-6.25
---
5
1500
---
-6.25
-6.25
---
0
14.95
---
-------
IADJ
53
-4.25
5
-4.25
0
IADJ
54
-41.25
5
-41.25
0
∆IADJ
(LINE)
∆IADJ
(LOAD)
55
---
---
---
56
-6.25
5
∆IADJ
(LOAD)
57
-6.25
1500
TA =
+150°C
3
42
TA =
-55°C
IL
(mA)
5
5
-4.25
-41.25
0
0
-----
-----
-----
Limits
Unit
Min
Max
IADJ = E26 / 2000
IADJ = E27 / 2000
25
25
100
100
µA
“
∆IADJ = (E26 – E27) / 2000
(LINE)
-5
5
“
∆IADJ = (E28 – E29) / 2000
(LINE)
-5
5
“
1.5
-1.30
3.5
-1.20
A
V
0.2
-1.30
1.0
-1.20
A
V
0.2
0.2
1.0
3.0
3.0
5.0
mA
“
“
-1.30
-1.20
V
See figure 9
waveforms
“
“
“
IOS1 = E30
VOUT5 = E31
(RECOV)
IOS2 = E32
VOUT6 = E33
(RECOV)
IQ1 = E34 / 2000
IQ2 = E35 / 2000
IQ3 = E36 / 2000
E37
“
VSTART = E37
See figure 9
waveforms
“
E38
“
VOUT7 = E38
-1.30
-1.20
V
None
“
“
“
9-11
“
“
“
V
“
“
“
VOUT1 = E39
VOUT2 = E40
VOUT3 = E41
VOUT4 = E42
-1.30
“
“
“
-1.20
“
“
“
V
“
“
“
---
“
“
E39
E40
E41
E42
---
“
VRLINE = E39 – E41
-23
23
mV
-------
-------
“
“
“
“
“
“
E43
E44
---
“
“
“
VRLOAD1 = E43 – E44
VRLOAD2 = E41 – E42
---12
-12
--12
12
“
“
“
---
---
---
K2
12-13
E45
mV
IADJ = E45 / 2000
25
100
---
---
---
“
“
“
IADJ = E46 / 2000
25
100
µA
“
---
---
---
---
“
“
E46
---
“
∆IADJ = (E45 – E46) / 2000
(LINE)
-5
5
“
-6.25
0
---
---
---
“
“
E47
“
5
14.95
---
---
---
“
“
E48
“
∆IADJ = (E47 – E48) / 2000
(LOAD)
-5
-6.25
“
“
-4.25
0
-4.25 14.95
-41.25
0
-41.25 1.95
---
See figure 9
waveforms
See
figure 9
waveforms
MIL-M-38510/118B
2
VIN
(volts)
-4.25
-41.25
Notes
TABLE III. Group A inspection for all device type 04 – Continued.
Subgroup
3
TA =
-55°C
Test
no.
Test conditions
See figure 9
Applied test voltages
(volts) (Hi – Lo pin potential)
1-2
4-5 6-11
7-2
8-2
IL
(mA)
-----
-10
-10
-----
-----
-0.425
-0.425
0
0
Relays
energized
Measurement
sense lines
Pins
Value
Units
K4,K5
K4,K5
10-5
9-11
E49
E50
V
“
IOS1 = E49
VOUT5 = E50
(RECOV)
IOS1
VOUT5
(RECOV)
58
59
IOS2
VOUT6
(RECOV)
IQ1
IQ2
IQ3
60
61
-40
-40
-----
-40
-40
-----
-----
-----
0
0
K5
K5
10-5
9-11
E51
E52
“
“
62
63
64
-4.25
-14.25
-41.25
-------
-4.25
-14.25
-41.25
0
0
0
-1.4
-1.4
-1.4
-------
-------
K3
K3
K3
12-13
12-13
12-13
E53
E54
E55
“
“
“
IOS2 = E51
VOUT6 = E52
(RECOV)
IQ1 = E53 / 2000
IQ2 = E54 / 2000
IQ3 = E55 / 2000
VSTART
65
-4.25
1500
-10
0
---
-0.425
---
K4
9-11
E56
“
VSTART = E56
See figure 9
waveforms
Equation
Notes
Symbol
43
4
TA =
+25°C
Notes
VIN
(volts)
-4.25
-4.25
Test conditions
Test
no.
Measurement
sense lines
Symbol Value
TA =
+25°C
7
Equation
∆VIN /
∆VOUT
66
Input voltage
VIN = -6.25 V
ei = 1.0 Vrms
at 2400 Hz
Load current
IL = 500 mA
See figure 9
waveforms
Units
eorms
E57
Vrms
Limits
Unit
Min
Max
1.5
-1.30
3.5
-1.20
A
V
0.2
-1.30
1.0
-1.20
A
V
0.2
0.2
1.0
3.0
3.0
5.0
mA
“
“
-1.30
-1.20
V
Limits
Unit
Min
Max
∆VIN / ∆VOUT = -20 log E57 See figure 10
50
---
dB
VNO
67
VIN = -6.25 V
IL = 100 mA
eorms
E58
Vrms
See figure 11
---
120
∆VOUT /
∆VIN
68
VIN = -6.25 V
Vpulse = -1.0 V
IL = 100 mA
VOUT
E59
V
∆VOUT / ∆VIN = E59 / 1
See figure 12
---
80
µVrms
mV/V
∆VOUT /
∆IL
69
VIN = -6.25 V
IL = 100 mA
∆IL = 400 mA
VOUT
E60
V
∆VOUT / ∆IL = E60 / 200
See figure 13
---
0.15
mV/mA
VNO = E58
MIL-M-38510/118B
Subgroup
Symbol
MIL-M-38510/118B
TABLE IV. Group C end point electrical parameters. (TA = +25°C)
Device
type
01, 02
03, 04
Characteristic
Symbol
Limits
Delta limits 1/
Units
Min
Max
-5.25
-4.75
0.5
4.0
Output voltage
VOUT
±50 mV
Standby current drain
ISCD
±20 %
Output voltage
VOUT
±10 mV
-1.275
-1.225
V
Adjust pin current
IADJ
±10 µA
25
100
µA
Line regulation
VRLINE
±4 mV
-9
9
mV
V
mA
Delta limits apply to the measured value (see delta limit definition in MIL-PRF-38535).
1/
6. NOTES
(This section contains information of a general or explanatory nature that may be helpful, but it is not mandatory.)
6.1 Intended use. Microcircuits conforming to this specification are intended for original equipment design applications and
logistic support of existing equipment.
6.2 Acquisition requirements. Acquisition documents should specify the following:
a.
Title, number, and date of the specification.
b.
Pin and compliance identifier, if applicable (see 1.2).
c.
Requirements for delivery of one copy of the quality conformance inspection data pertinent to the device inspection
lot to be supplied with each shipment by the device manufacturer, if applicable.
d.
Requirements for certificate of compliance, if applicable.
e.
Requirements for notification of change of product or process to contracting activity in addition to notification to the
qualifying activity, if applicable.
f.
Requirements for failure analysis (including required test condition of method 5003 of MIL-STD-883), corrective
action, and reporting of results, if applicable.
g.
Requirements for product assurance options.
h.
Requirements for special carriers, lead lengths, or lead forming, if applicable. These requirements should not affect
the part number. Unless otherwise specified, these requirements will not apply to direct purchase by or direct
shipment to the Government.
i.
Requirements for "JAN" marking.
j.
Packaging requirements (see 5.1).
44
MIL-M-38510/118B
6.3 Qualification. With respect to products requiring qualification, awards will be made only for products which are, at the time
of award of contract, qualified for inclusion in Qualified Manufacturers List QML-38535 whether or not such products have
actually been so listed by that date. The attention of the contractors is called to these requirements, and manufacturers are
urged to arrange to have the products that they propose to offer to the Federal Government tested for qualification in order that
they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. Information
pertaining to qualification of products may be obtained from DSCC-VQ, 3990 E. Broad Street, Columbus, Ohio 43128-3990.
6.4 Superseding information. The requirements of MIL-M-38510 have been superseded to take advantage of the
available Qualified Manufacturer Listing (QML) system provided by MIL-PRF-38535. Previous references to MIL-M-38510 in this
document have been replaced by appropriate references to MIL-PRF-38535. All technical requirements now consist of this
specification and MIL-PRF-38535. The MIL-M-38510 specification sheet number and PIN have been retained to avoid adversely
impacting existing government logistics systems and contractor’s parts lists.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535, MIL-HDBK-1331, and as follows:
6.5.1 Line regulation. The change in output voltage for a specified change in input voltage (VRLINE).
6.5.2 Load regulation. The change in output voltage for a specified change in load current (VRLOAD).
6.5.3 Ripple rejection. The ratio of the peak to peak input ripple voltage to the peak to peak output ripple voltage
(∆VOUT / ∆VIN).
6.5.4 Output noise voltage. The rms output noise voltage with constant load and no input ripple (VNO).
6.5.5 Standby current drain. The supply current drawn by the regulator with no output load or with a 1 kilohm output load.
6.5.6 Minimum load current. The minimum load current is that current required to maintain regulation.
6.5.7 Input voltage range. The range of supply voltage over which the regulator will operate.
6.5.8 Output voltage range. The range of output voltage over which the regulator will operate.
6.5.9 Transient response. The closed-loop step function response of the regulator under small-signal conditions.
6.6 Logistic support. Lead materials and finishes (see 3.3) are interchangeable. Unless otherwise specified, microcircuits
acquired for Government logistic support will be acquired to device class B (see 1.2.2), lead material and finish A (see 3.4).
Longer length leads and lead forming should not affect the part number.
45
MIL-M-38510/118B
6.7 Substitutability. The cross-reference information below is presented for the convenience of users. Microcircuits covered
by this specification will functionally replace the listed generic-industry type. Generic-industry microcircuit types may not have
equivalent operational performance characteristics across military temperature ranges or reliability factors equivalent to MIL-M38510 device types and may have slight physical variations in relation to case size. The presence of this information should not
be deemed as permitting substitution of generic-industry types for MIL-M-38510 types or as a waiver of any of the provisions of
MIL-PRF-38535.
Military device type
01
02
03
04
Generic-industry type
79MG
79G
LM137H
LM137K
6.8 Changes from previous issue. Marginal notations are not used in this revision to identify changes with respect to the
previous issue, due to the extensiveness of the changes.
Custodians:
Army - CR
Navy - EC
Air Force - 11
NASA - NA
DLA - CC
Preparing activity:
DLA - CC
Project 5962-2005-016
Review activities:
Army – MI, SM
Navy – AS, CG, MC, SH, TD
Air Force – 03, 19, 99
NOTE: The activities listed above were interested in this document as of the date of this document. Since organizations and
responsibilities can change, you should verify the currency of the information above using the ASSIST Online database at
http://assist.daps.dla.mil.
46
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