FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20596A Generic Copy Issue Date: 9-Sep-2014 TITLE: Qualification of CZ4 Fab (Czech Republic) as an additional wafer source for N-Channel and P-Channel JFET. PROPOSED FIRST SHIP DATE: 10-Dec-2014 AFFECTED CHANGE CATEGORY(S): ON Semiconductor Fab Site FOR ANY QUESTIONS CONCERNING THIS NOTIFICATION: Contact your local ON Semiconductor Sales Office or Farrah Omar <[email protected]> SAMPLES: Contact your local ON Semiconductor Sales Office ADDITIONAL RELIABILITY DATA: Available Contact your local ON Semiconductor Sales Office or Laura Rivers <[email protected]> NOTIFICATION TYPE: Final Product/Process Change Notification (FPCN) Final change notification sent to customers. implementation of the change. FPCNs are issued at least 90 days prior to ON Semiconductor will consider this change approved unless specific conditions of acceptance are provided in writing within 30 days of receipt of this notice. To do so, contact <[email protected]>. DESCRIPTION AND PURPOSE: This is the Final Notification by ON Semiconductor notifying customers of its plan to qualify CZ4 Fab (Czech Republic) as an additional wafer source from current ISMF Fab (Malaysia) for N-Channel and P-Channel JFET. The CZ4 Fab facility is an ON Semiconductor owned wafer fab that has been producing products for ON Semiconductor. Several existing technologies within ON Semiconductor’s product families are currently sourced from CZ4 Fab. ON Semiconductor CZ4 Wafer Fab is an internal factory that is TS16949, ISO-9001 and ISO-14000 certified. Qualification tests are designed to show that the reliability of the devices will continue to meet or exceed ON Semiconductor standards. Issue Date: 9-Sep-2014 Rev. 06-Jan-2010 Page 1 of 2 FINAL PRODUCT/PROCESS CHANGE NOTIFICATION #20596A RELIABILITY DATA SUMMARY: Package: SOT23 MMBFJ310LT1G Test: HTRB HTGB HAST+PC Interval: 1008 hrs 1008 hrs 96 hrs Results 0/84 0/84 0/84 UHAST+PC Conditions: TA=150C,80% Rated Voltage Ta = 150C, 100% Vgss Ta=130C RH=85% bias=80% rated V or100V Max Ta=130C RH=85% 96 hrs 0/84 TC+PC Ta= -65 C to 150 C 1000 cyc 0/84 Interval: 1008 hrs 1008 hrs 96 hrs Results 0/84 0/84 0/84 MMBFJ175LT1G Test: HTRB HTGB HAST+PC UHAST+PC Conditions: TA=150C,80% Rated Voltage Ta = 150C, 100% Vgss Ta=130C RH=85% bias=80% rated V or100V Max Ta=130C RH=85% TC+PC Ta= -65 C to 150 C 96 hrs 0/84 1000 cyc 0/84 ELECTRICAL CHARACTERISTIC SUMMARY: There are no changes in electrical characteristics and product performance meets data sheet Specifications. Characterization data is available upon request. CHANGED PART IDENTIFICATION: Affected products from ON Semiconductor with date code 1450 representing WW50, 2014 and greater may be sourced from either the CZ4 Fab (Czech Republic) or the ISMF Fab (Malaysia). List of affected General Parts: SMMBFJ175LT1G SMMBFJ177LT1G Issue Date: 9-Sep-2014 Rev. 06-Jan-2010 Page 2 of 2