DC2150A - MET Labs EMC Test Report

MET Laboratories, Inc.
Safety Certification - EMC - Telecom- Environmental Simulation
914 WEST PATAPSCO AVENUE • BALTIMORE, MARYLAND 21230 • PHONE (410) 354-3300 • FAX (410) 354-3313
33439 WESTERN AVENUE • UNION CITY, CALIFORNIA 94587 • PHONE (510) 489-6300 • FAX (510) 489-6372
3162 BELICK STREET • SANTA CLARA, CALIFORNIA 95054 • PHONE (408) 748-3585 • FAX (510) 489-6372
13301 MCCALLEN PASS • AUSTIN, TEXAS 78753 • PHONE (512) 287-2500 • FAX (512) 287-2513
August 26, 2014
Linear Technology Corporation
1630 McCarthy Blvd
Milpitas, CA 95035-7417
Dear Dan Eddleman
Enclosed is the EMC report for the Linear Technology Corporation, LTC4366/LT4363 MIL-STD-1275D Surge
Stopper Model DC2150A-C tested to the requirements of MIL-STD-1275D.
Thank you for using the services of MET Laboratories, Inc. If you have any questions regarding these results or
if MET can be of further service to you, please feel free to contact me.
Sincerely yours,
MET LABORATORIES, INC.
Jill Valdes
Documentation Department
Reference: (\Linear Technology Corporation\EMCS42676-MIL)
Certificates and reports shall not be reproduced except in full, without the written permission of MET Laboratories, Inc. T his letter of transmittal is not a
part of the attached report.
The Nation’s First Licensed Nationally Recognized Testing Lab oratory
MET Laboratories, Inc.
Safety Certification - EMC - Telecom- Environmental Simulation
914 WEST PATAPSCO AVENUE • BALTIMORE, MARYLAND 21230 • PHONE (410) 354-3300 • FAX (410) 354-3313
33439 WESTERN AVENUE • UNION CITY, CALIFORNIA 94587 • PHONE (510) 489-6300 • FAX (510) 489-6372
3162 BELICK STREET • SANTA CLARA, CALIFORNIA 95054 • PHONE (408) 748-3585 • FAX (510) 489-6372
13301 MCCALLEN PASS • AUSTIN, TEXAS 78753 • PHONE (512) 287-2500 • FAX (512) 287-2513
Electromagnetic Compatibility Criteria
Test Report
For The:
Linear Technology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stopper Model DC2150A-C
Tested Under:
MIL-STD-1275D
MET Report: EMCS42676-MIL
August 26, 2014
Prepared For:
Linear Technology Corporation
1630 McCarthy Blvd
Milpitas, CA 95035-7417
Prepared By:
MET Laboratories, Inc.
3162 Belick Street
Santa Clara, CA 95054
Certificates and reports shall not be reproduced except in full, without the written permission of MET Laboratories, Inc.
DOC-EMC1301 8/22/2008
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
MIL-STD-1275D
Electromagnetic Compatibility Criteria
Test Report
For the:
Linear Technology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stopper Model DC2150A-C
Tested under:
MIL-STD-1275D
Testing Reviewed By:
Report Prepared By:
Joseph Dizon
MIL EMC Test Engineer, Electromagnetic Compatibility Lab
Jill Valdes
Documentation Department
Engineering Statement: T he measurements shown in this report were made in accordance with the procedures indicated, and the emissions from this
equipment were found to be within the applicable limits. I assume full responsibility for the accuracy and completeness of these measurements, and for the
qualifications of all persons taking them. It is further stated that upon the basis of the measurements made, the equipment tested is capable of operation in
accordance with the requirements of MIL-ST D-1275D, December 10, 2007 under normal use and maintenance.
Asad Bajwa,
Director, Electromagnetic Compatibility Lab
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page ii of vi
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
Re port Status Sheet
MIL-STD-1275D
Report Status Sheet
Revision
Report Date
Reason for Revision
∅
August 26, 2014
Initial Issue.
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page iii of vi
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
Table of Contents
MIL-STD-1275D
Table of Contents
I.
II.
III.
IV.
Executi ve Summary .................................................................................................................................................................... 1
A. Executive Su mmary ...............................................................................................................................................................2
Equi pment Configuration ......................................................................................................................................................... 3
A. Overview ..................................................................................................................................................................................4
B. References ................................................................................................................................................................................4
C. Test Site ....................................................................................................................................................................................5
D. Description of Test Sample ...................................................................................................................................................5
E. Mode of Operation..................................................................................................................................................................5
F. Method of Monitoring EDUT Operation ............................................................................................................................5
G. Modifications...........................................................................................................................................................................5
a)
Modifications to EDUT .................................................................................................................................5
b)
Modifications to Test Procedure ..................................................................................................................5
c)
Modifications to Test Standard ....................................................................................................................5
H. Equip ment Configuration ......................................................................................................................................................6
I. Support Equip ment .................................................................................................................................................................6
J. Ports and Cabling Info rmation .............................................................................................................................................6
K. General Test Setup..................................................................................................................................................................7
L. Disposition of EDUT .............................................................................................................................................................7
Electromagnetic Compati bility Criteria................................................................................................................................ 8
4.3 EDUT Co mpatibility ...................................................................................................................................................... 9
5.1.2 Starting Mode ............................................................................................................................................................. 12
5.3.2 Vehicle Equip ment .................................................................................................................................................... 20
Test Equi pment ..........................................................................................................................................................................48
List of Tables
Table 1. Executive Su mmary of MIL-STD-1275D Co mplianceTesting ............................................................................................ 2
Table 2. Equ ip ment Configuration ............................................................................................................................................................ 6
Table 3. Support Equip ment ....................................................................................................................................................................... 6
Table 4. Ports and Cabling Informat ion.................................................................................................................................................... 6
Table 5. 4.3 EDUT Co mpatib ility Test Results....................................................................................................................................... 9
Table 6. 5.1.2 Calibration Result ............................................................................................................................................................. 13
Table 7. 5.3.2.2: Vo ltage spikes exported fro m EDUT Test Results................................................................................................. 22
Table 8. Vo ltage spikes imported into EDUT, Calibrat ion Result ...................................................................................................... 25
Table 9. Vo ltage spikes imported into EDUT, Test Result .................................................................................................................. 25
Table 10. Vo ltage surges imported into EDUT, 40VDC surge calibration on 20mΩ source impedance .................................... 31
Table 11. Vo ltage surges imported into EDUT, 100VDC surge calibration on 500mΩ source impedance................................ 31
Table 12. Vo ltage surges imported into EDUT, Test Result................................................................................................................ 31
Table 13. Ripple voltage imported into EDUT Test Results .............................................................................................................. 39
Table 14. Detailed List of Test Equip ment ............................................................................................................................................ 49
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Page iv of vi
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
Table of Contents
MIL-STD-1275D
List of Figures
Figure
Figure
Figure
Figure
Figure
Figure
Figure
1. Block Diagram of Test Configuration ..................................................................................................................................... 7
2. Start ing Disturbances ................................................................................................................................................................ 13
3. MIL-STD-1275D Exported Spike Test Circu it .................................................................................................................... 20
4. MIL-STD-1275D Exported Spike Test Circu it (EDUT with Remote Switch)............................................................... 21
5. MIL-STD-1275D Imported Spike Test Circu it .................................................................................................................... 24
6. MIL-STD-1275D Imported Surge Test Circuit for 28 VDC Systems ............................................................................. 30
7. 5.3.2.4: Ripple voltage impo rted into EDUT......................................................................................................................... 38
List of Plots
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
Plot
1. 4.3 EDUT Co mpatib ility Test Results........................................................................................................................................ 10
2. Init ial Engagement Surge and Cranking Level, Calibration, IES Vo ltage and Duration .................................................. 14
3. Init ial Engagement Surge and Cranking Level, Calibration, Cranking Voltage Level...................................................... 15
4. Init ial Engagement Surge and Cranking Level, Calibration, IES and Cranking Repetit ion Rate.................................... 16
5. Init ial Engagement Surge, Test Results ..................................................................................................................................... 17
6. Init ial Engagement Surge and Cranking Level, Test Results ................................................................................................. 18
7. 5.3.2.2 Vo ltage spikes exported fro m EDUT, W ithout Switch, Test Results ..................................................................... 22
8. 5.3.2.2 Vo ltage spikes exported fro m EDUT, W ith Switch, Test Results ........................................................................... 23
9. 5.3.2.2 Vo ltage spikes imported into EDUT, Positive Sp ike Calibration ............................................................................ 26
10. 5.3.2.2Vo ltage spikes imported into EDUT, Negative Spike Calibrat ion ......................................................................... 27
11. 5.3.2.2 Voltage spikes imported into EDUT, Positive Test Results ................................................................................... 28
12. Vo ltage spikes imported into EDUT, Negative Test Results ............................................................................................... 29
13. 5.3.2.4 Voltage surges imported into EDUT, 40 VDC surge with 20 mΩ source impedance, Surge voltage and
Pulse duration Calibrat ion ................................................................................................................................................................. 32
14. 5.3.2.4 Voltage surges imported into EDUT, 40 VDC surge with 20 mΩ source impedance, Pulse period
Calibrat ion............................................................................................................................................................................................ 33
15. 5.3.2.4 Voltage surges imported into EDUT, 100 VDC surge with 500 mΩ source impedance, Surge voltage and
Pulse duration Calibrat ion ................................................................................................................................................................. 34
16. 5.3.2.4 Voltage surges imported into EDUT, 100 VDC surge with 500 mΩ source impedance, Pulse period
Calibrat ion............................................................................................................................................................................................ 35
17. 5.3.2.4 Voltage surges imported into EDUT, 40 VDC Surge Test Results ....................................................................... 36
18. 5.3.2.4 Voltage surges imported into EDUT, 100 VDC Surge Test Results..................................................................... 37
19. 5.3.2.4 Ripple voltage impo rted into EDUT, 50 Hz Calibrat ion ......................................................................................... 40
20. 5.3.2.4 Ripple voltage impo rted into EDUT, 12 kHz Calibration ....................................................................................... 41
21. 5.3.2.4 Ripple voltage impo rted into EDUT, 48 kHz Calibration ....................................................................................... 42
22. 5.3.2.4 Ripple voltage impo rted into EDUT, 200 kHz Calibration..................................................................................... 43
23. 5.3.2.4 Ripp le voltage imported into EDUT, 50 Hz Test Results ........................................................................................ 44
24. 5.3.2.4 Ripple voltage impo rted into EDUT, 12 kHz Test Results ..................................................................................... 45
25. 5.3.2.4 Ripple voltage impo rted into EDUT, 48 kHz Test Results ..................................................................................... 46
26. 5.3.2.4 Ripple voltage impo rted into EDUT, 200 kHz Test Result .................................................................................... 47
List of Photographs
Photograph 1. 4.3 EDUT Co mpatib ility Test Setup ............................................................................................................................. 11
Photograph 2. 5.1.2 Starting Mode Test Results Setup........................................................................................................................ 19
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page v of vi
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
Table of Contents
MIL-STD-1275D
List of Terms and Abbreviations
The following abbreviations may be referenced within this report.
AC
Alternating Current
Amp or A
Amperes
AS W
Anti-submarine warfare
dB
Decibels
dBpT
Decibels above one pico-tesla
dBµA
Decibels above one microamp
dBµV
Decibels above one microvolt
dBµA/m
Decibels above one microamp per meter
dBµV/m
Decibels above one microvolt per meter
cm
centimeter
DC
Direct Current
EMITR
Electromagnetic Interference Test Report
EDUT
Equipment Under Test
G
Gig
H
M agnetic Field
H/V
Horizontal/Vertical
Hz
Hertz
in
inch
Ip
Peak current at 1st cycle
kHz
kilohertz
kV
kilovolt
LIS N
Line Impedance S tabilization Network
m
Meter
max
Maximum
MHz
Megahertz
nS
Nano-second
H
Microhenry
V/m
Volts per meter
W
Watt
Ω
Ohm
%
Percent
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page vi of vi
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
Exe cutive Summary
MIL-STD-1275D
I. Executive Summary
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 1 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
A.
Ele ctromagnetic Compatibility
Exe cutive Summary
MIL-STD-1275D
Executive Summary
Tests were conducted on a sample of the equipment for the purpose of determining compliance with the applicable
specifications of MIL-STD-1275D EMC requirements as listed in Table 1. Unless otherwise documented, all
testing was performed in accordance with the Linear Technology Corporation Purchase Order X11128F.
S pecification and
S ection Number
M IL-STD-1275D Section 4.3
Test Description
Conformance
EDUT Compatibility
Compliant
MIL-S TD-1275D S ection 5.1.2 S tarting Mode Testing
M IL-STD-1275D Section 5.1.2
Starting Disturbances- Initial Engagement Surge and
Cranking Surge (according to Section 3.1.6)
Compliant
MIL-S TD-1275D S ection 5.3.2 Vehicle Equipment
M IL-STD-1275D Section 5.3.2.2
Voltage spikes exported from EDUT
Compliant
M IL-STD-1275D Section 5.3.2.3
Voltage spikes imported into EDUT
Compliant
M IL-STD-1275D Section 5.3.2.4
Voltage surges imported into EDUT
Compliant
M IL-STD-1275D Section 5.3.2.5
Ripple voltage imported into EDUT
Compliant
Table 1. Executive Summary of MIL-STD-1275D ComplianceTesting
MET Re port: EMCS42676-MIL
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Page 2 of 49
Linear Te chnology Corporation
POP300D-IVT Ele ctro-optical/Infrare d/Lase r Designator Payload
Ele ctromagnetic Compatibility
Equipment Configuration
MIL-STD-1275D
II. Equipment Configuration
MET Re port: EMCS42676-MIL
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Linear Te chnology Corporation
POP300D-IVT Ele ctro-optical/Infrare d/Lase r Designator Payload
A.
Ele ctromagnetic Compatibility
Equipment Configuration
MIL-STD-1275D
Overview
Tests were conducted on a sample of the Linear Technology Corporation, LTC4366/LT4363 MIL-STD-1275D
Surge Stopper Model DC2150A-C equipment for the purpose of determining compliance with the applicable
specifications limits to the Department of Defense Interface Standard; Requirements for the Control of
Electromagnetic Interference Characteristics of Subsystems and Equipment, 10 December 2007. The results
obtained relate only to the item(s) tested.
Model(s) Tested:
LTC4366/ LT4363 MIL-STD-1275D Surge Stopper Model DC2150A-C
Model(s) covered:
LTC4366/ LT4363 MIL-STD-1275D Surge Stopper Model DC2150A-C
Power Specifications:
28 VDC, 4A
Physical Dimensions:
Size: (HxWxD): 2.5 x 5 x 3.5 inches
Weight: 0.25 lbs.
Evaluated by:
Test date(s) covered:
B.
Joseph Dizon
07/28/2014 – 07/30/2014
References
MIL-STD-1275D
SAE J1113-2
ANSI/ISO/IEC 17025: 2005
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
Characteristics of 28 Volt DC Electrical Systems in Military Vehicles
Society of Automotive Engineers, Electromagnetic Compatibility
Measurement Procedure for Vehicle Components- Part 2: Conducted
Immunity 15Hz to 250kHz All Leads
General Requirements for the Competence of Testing and Calibration
Laboratories
© 2014, MET Laboratories, Inc.
Page 4 of 49
Linear Te chnology Corporation
POP300D-IVT Ele ctro-optical/Infrare d/Lase r Designator Payload
C.
Ele ctromagnetic Compatibility
Equipment Configuration
MIL-STD-1275D
Test Site
All testing was performed at MET Laboratories, Inc., 3162 Belick Street, Santa Clara, CA 95054. All test
equipment used in making EMC Compliance determinations is accurate and bears recent traceability to the
National Institute of Standards and Technology.
D.
Description of Test Sample
The LTC4366/LT4363 MIL-STD-1275D Surge Stopper provides an output voltage that is limited to 44V when
faced with MIL-STD-1275D’s surge, spike, and ripple conditions. In most circumstances, MIL-STD-1275D
compliance may be achieved by placing this circuit in front of a 44V tolerant device. This circuit provides up to 4
Amps to the output in all conditions except the ±7V ripple condition (14Vpeak-to-peak). During the ripple
condition, up to 2.8A is provided to the load.
E.
Mode of Operation
The EDUT was operated in normal mode of operation by loading the output with a 10 ohm resistor during the
MIL-STD-1275D input test conditions. The output remained powered during all conditions.
F.
Method of Monitoring EDUT Operation
The EDUT was monitored during testing by observing the EDUT’s input and output voltages with an oscilloscope.
The output voltage did not drop to less than 2V below the input voltage except when the input voltage was greater
than 44V, in which case the output voltage was limited to less than 46V.
G.
Modifications
a)
Modifications to EDUT
No modifications were made to the EDUT.
b)
Modifications to Test Procedure
No modifications were made to the Test Procedure.
c)
Modifications to Test Standard
No modifications were made to the Test Standard.
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Ele ctromagnetic Compatibility
Equipment Configuration
MIL-STD-1275D
Linear Te chnology Corporation
POP300D-IVT Ele ctro-optical/Infrare d/Lase r Designator Payload
H.
Equipment Configuration
The EDUT was set up as outlined in Figure 1. All equipment incorporated as part of the EDUT is included in the
following list.
Ref. ID
A
Name / Description
LTC4366/ LT4363
MIL-STD-1275D Surge Stopper
Model Number
Part Number
Serial Number
Rev. #
DC2150A-C
N/A
N/A
2
Table 2. Equipment Configuration
I. Support Equipment
All support equipment necessary for the operation and testing of the EDUT is included in the following list.
Name / Description
Manufacturer
Model Number
10 ohm load
N/A
N/A
Customer Supplied
Calibration Data
N/A
Table 3. Support Equipment
J.
Ref.
ID
1
2
3
4
Ports and Cabling Information
Port Name
INPUT
GND
OUTPUT
GND
Cable
Description
Banana
Banana
Banana
Banana
Qty.
1
1
1
1
Length
Tested (m)
1
1
0.5
0.5
Max Length
(m)
2
2
1
1
Shielded
(Y/N)
No
No
No
No
Termination Box ID
& Port Name
Test Fixture
Test Fixture
10 ohm load
10 ohm load
Table 4. Ports and Cabling Information
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DOC-EMC1301 8/22/2008
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Page 6 of 49
Linear Te chnology Corporation
POP300D-IVT Ele ctro-optical/Infrare d/Lase r Designator Payload
Ele ctromagnetic Compatibility
Equipment Configuration
MIL-STD-1275D
Figure 1. Block Diagram of Test Configuration
K.
General Test Setup
For table top equipment, a 2.25 square meter copper ground plane was positioned atop a non-conductive test bench
and electrically bonded to the shielded enclosure at intervals of 90cm or less. The EDUT was placed on the copper
ground plane and bonded using MIL-STD-1275D test setup methods. As per MIL-STD-1275D, the DC bonding
resistance was verified to be less than 2.5mΩ between the ground plane and the shielded enclosure.
Where bonding of the test sample was necessary to simulate actual installations, connections were made identically
to those specified in the installation, and all corrosion at the interface of the chamber floor and bonding surface of
the EDUT was completely removed prior to fastening.
L.
Disposition of EDUT
The test sample including all support equipment (if any), submitted to the Electro-Magnetic Compatibility Lab for
testing was returned to Linear Technology Corporation upon completion of testing.
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DOC-EMC1301 8/22/2008
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Page 7 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
III. Electromagnetic Compatibility Criteria
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DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 8 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
4.3 EDUT Compatibility
Test Requirement(s):
MIL-STD-1275D, Section 4.3: All EDUT units shall be able to withstand voltage transients as
specified herein. The EDUT shall continue normal operation without damage to its components.
The EDUT shall provide protection against polarity reversal as a result of slave starting or other
improper connections.
Test Procedure:
A reverse polarity voltage was applied at the input of the EDUT while the output was observed.
There shall be no damage on the components of the EDUT and functionality shall maintain after
the application of the test.
Test Results:
The EDUT was compliant with the specifications of MIL-STD-1275D, Section 4.3.
Test Engineer(s):
Joseph Dizon
Test Date(s):
07/29/2014
Test
Result
Reverse Polarity
Pass
Notes
No Anomalies Observed
EDUT continued to work after performing the test.
Table 5. 4.3 EDUT Compati bility Test Results
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DOC-EMC1301 8/22/2008
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Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 1. 4.3 EDUT Compati bility Test Results
Trace 1
Trace 3
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DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 10 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Test Setup
Photograph 1. 4.3 EDUT Compati bility Test Setup
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DOC-EMC1301 8/22/2008
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Page 11 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
5.1.2 Starting Mode
Test Requirement(s):
MIL-STD-1275D, Section 5.1.2:
5.1.2.2: Initial Engagement Surges
During the starting disturbance outlined in 5.1.2.1, the voltage shall not fall below 6 VDC and
the duration shall not exceed 1 second.
5.1.2.3: Cranking
The steady voltage during cranking shall not fall below 16 VDC. No more than three cranking
attempts of 30 seconds each with 2 minute cranking level pauses between attempts.
Test Procedure:
Under-voltage variations from the steady-state nominal voltage source are caused by engine
starter engagement and cranking. A typical profile showing “Initial Engagement Surge” (IES)
and “Cranking Level” is given in Figure 2. Using a digital Oscilloscope, the ‘overall’ IES
duration was recorded from which the nominal voltage level departed towards 6VDC to the
instant at which it reached the cranking level. The cranking duration was no more than 30
seconds in length and had a minimum delay of 2 minutes in between cranking sets. During the
initial engagement surge, the voltage was not allowed to fall below 6 VDC and the ramp duration
towards cranking did not exceed 1 second. The steady voltage during cranking did not fall below
16 VDC (no more than three cranking attempts of 30 seconds each with 2 minute cranking level
pauses between attempts).
Prior to testing, the Initial Engagement Surge and Cranking Surge were verified from a
Programmable AC/DC Power Supply on a digital Oscilloscope. Once the waveform was precalibrated, the pre-programmed waveforms were simultaneously applied to the DC Power input
port of the product, while monitoring the performance of the product.
Per the requirements of MIL-STD-1275, all voltage measurements were performed at the
utilization equipment power input terminals.
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
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Page 12 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Figure 2. Starting Disturbances
Test Results:
The EDUT was compliant with the specifications of MIL-STD-1275D, Section 5.1.2.
Test Engineer(s):
Joseph Dizon
Test Date(s):
07/30/2014
Target
Actual
IES target
Voltage
6 VDC
6 VDC
IES Duration
1 s max.
999.6 ms
Cranking Level
voltage
16 VDC min.
16 VDC
Cranking
Duration
30s max.
30s
Repetition
3 max
3
Table 6. 5.1.2 Calibration Result
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Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 2. Initial Engagement Surge and Cranking Level, Calibration, IES Voltage and Duration
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DOC-EMC1301 8/22/2008
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Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 3. Initial Engagement Surge and Cranking Level, Calibration, Cranking Voltage Level
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Page 15 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 4. Initial Engagement Surge and Cranking Level, Calibration, IES and Cranking Repetition Rate
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 16 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 5. Initial Engagement Surge, Test Results
Trace 1
Trace 3
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 17 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 6. Initial Engagement Surge and Cranking Level, Test Results
Trace 1
Trace 3
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 18 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Test Setup
Photograph 2. 5.1.2 Starting Mode Test Results Setup
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 19 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
5.3.2 Vehicle Equipment
5.3.2.2: Voltage spikes exported from EDUT
Test Requirement(s):
No EDUT exported voltage spike (transient) shall exceed the given envelopes of the normal
operating and generator-only modes for the appropriate voltage system when measured with the
EDUT “switching”. No spike or combination of spikes arising from a single switching event
shall have an energy content exceeding 15 milli-joules.
The “Spike” voltage test limit is +250V for the first 75mS, then decreasing linearly from +250V
to ±100V at 75mS to 1000mS, respectively.
Test Procedure:
Using the test circuit shown in Figure 3, the EDUT was operated over its specified range of
functions.
Figure 3. MIL-STD-1275D Exported Spike Test Circuit
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 20 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Any switching operation capable of producing spikes was repeated a sufficient number of times
to give a reasonable probability that the maximum spike voltage was recorded (e.g. 20
operations). In addition, where the power supply to the EDUT is normally provided via an
independent vehicle mounted switch, the test was repeated using this switch connected as shown
in Figure 4.
Figure 4. MIL-STD-1275D Exported Spike Test Circuit (EDUT with Remote Switch)
Test Results:
The EDUT was compliant with the specifications of MIL-STD-1275D, Section 5.3.2.2
Test Engineer(s):
Joseph Dizon
Test Date(s):
07/30/2014
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 21 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Test
Exported Spike Test without switch
Exported Spike Test with switch
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Result
Pass
Pass
Notes
No spikes observed
No spikes observed
Table 7. 5.3.2.2: Voltage spikes exported from EDUT Test Results
Plot 7. 5.3.2.2 Voltage spikes exported from EDUT, Without Switch, Test Results
Trace 1
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
© 2014, MET Laboratories, Inc.
Page 22 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 8. 5.3.2.2 Voltage spikes exported from EDUT, With Switch, Test Results
Trace 1
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
© 2014, MET Laboratories, Inc.
Page 23 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
5.3.2.3: Voltage spikes imported into EDUT
Test Requirement(s):
The EDUT shall not be damaged by Normal Mode- Imported Spikes as described in MIL-STD1275D paragraph 5.3.2.3.
A spike is a high frequency oscillatory variation from the controlled steady state level of a
characteristic. The spike results from a very high frequency current of complex waveforms
produced when reactive loads are switched. An individual damped sinusoidal spike waveform
generally has an interval lasting less than 50μS, but may take up to 1mS to decay from the steady
state (nominal) level.
The following figure represents a theoretical representation of the Imported Spike waveform.
Test Procedure:
An acceptable test circuit is shown in Figure 5.
Figure 5. MIL-STD-1275D Imported Spike Test Circuit
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 24 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Tests were carried out with both polarities of voltage spikes. The number of applications of
spikes will depend upon the EDUT. A minimum of fifty 250V spikes, of each polarity, were
applied at one (1) second intervals. Each test spike shall have peak amplitude of 250V, a risetime not exceeding 50 ns, a frequency of oscillation greater than 100 kHz and less than 500 kHz,
and a maximum energy content of 15 milli-joules. The voltage spikes so imposed shall not
damage the EDUT components, nor affect the normal operation of the EDUT. Any deviation
from normal operation, even an intermittent anomaly, such that it eventually returns to normal
operation, was recognized as a failure of the EDUT.
Test Results:
The EDUT was compliant with the specifications of MIL-STD-1275D, Section 5.3.2.3
Test Engineer(s):
Joseph Dizon
Test Date(s):
07/30/2014
Target
+ Spike Calibration
- Spike Calibration
Peak Amplitude
250 V
255.8 V
260.7 V
Rise Time
<50 ns
<23.4 ns
<16.2 ns
Frequency of oscillation
100 kHz – 500 kHz
307.165 kHz
305.156 kHz
Energy content
<15 millijoules
6.65 millijoules
6.70 millijoules
Table 8. Voltage spikes imported into EDUT, Calibration Result
Test
Positive Spike
Negative Spike
Result
Pass
Pass
Notes
No Anomalies Observed
No Anomalies Observed
Table 9. Voltage spikes imported into EDUT, Test Result
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 25 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 9. 5.3.2.2 Voltage spikes imported into EDUT, Positive Spike Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 26 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 10. 5.3.2.2Voltage spikes imported into EDUT, Negative Spike Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 27 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 11. 5.3.2.2 Voltage spikes imported into EDUT, Positive Test Results
Trace 1
Trace 3
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 28 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 12. Voltage spikes imported into EDUT, Negative Test Results
Trace 1
Trace 3
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 29 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
5.3.2.4: Voltage surges imported into EDUT
Test Requirement(s):
The voltage surges imposed shall not damage the EDUT components, nor affect the Normal
Mode or Generator Only mode of operation of the EDUT. Any deviation from normal
operation, even an intermittent anomaly, such that it eventually returns to normal operation, is
recognized as a failure of the EDUT.
A surge is a variation from the controlled steady-state (typically nominal) level of a
characteristic, resulting from inherent regulation of the electrical power supply system and
remedial action by the regulator, except for battery only operation. Surges may also occur due to
the application of loads in a battery only condition. Surges are transient with duration greater
than 1mS, and have a recovery time limitation.
Test Procedure(s):
For these tests, simulated voltage surge pulses in both the normal operating and generator-only
modes were applied to the EDUT while it was operating within steady state conditions. The
vehicle electrical system was represented in both the normal operating and generator-only
modes. An acceptable circuit is shown in Figure 6.
Figure 6. MIL-STD-1275D Imported Surge Test Circuit for 28 VDC Systems
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 30 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
When simulating voltage surges in the Normal Mode, pulses of +40V total amplitude with 50mS
duration, from a source impedance of 20mΩ (i.e. representative of vehicle wire), were applied.
The nominal supply voltage was maintained both before and after each pulse. The pulses were
applied 5 times, with a 1 second delay between pulses.
After simulating voltage surges in the normal operating mode, pulses of +100V total amplitude
with 50mS duration, from a source impedance of 500mΩ (i.e. 50W or higher rated power
resistor) were applied to simulate voltage surges in the Generator Only mode. The nominal
supply voltage was maintained both before and after each surge. The pulses were applied 5
times, with a 1 second delay between pulses.
The voltage surges specified in 5.3.2.4b and 5.3.2.4c had the amplitude established before
connection of the EDUT. The power source was maintained constant during the surge. The rise
and fall times of the surge were approximately 1mS. A minimum total of five +40V surges, and
five +100V surges, were applied to the EDUT sample.
Test Results:
The EDUT was compliant with the specifications of MIL-STD-1275D, Section 5.3.2.4
Test Engineer(s):
Joseph Dizon
Test Date(s):
07/30/2014
Target
Calibrated
Surge Voltage
40 VDC
41.88 VDC
Pulse Duration
50 ms
49.861 ms
Delay per pulse
1s
1s
# of Pulses
5
5
Table 10. Voltage surges imported into EDUT, 40VDC surge calibration on 20mΩ source impedance
Target
Calibrated
Surge Voltage
100 VDC
100.9 VDC
Pulse Duration
50 ms
49.955 ms
Delay per pulse
1s
999.9 ms
# of Pulses
5
5
Table 11. Voltage surges imported into EDUT, 100VDC surge calibration on 500mΩ source impedance
40 VDC Surge
100 VDC Surge
Result
Pass
Pass
Notes
No anomalies observed
No anomalies observed
Table 12. Voltage surges imported into EDUT, Test Result
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 31 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 13. 5.3.2.4 Voltage surges imported into EDUT, 40 VDC surge with 20 mΩ source impedance, Surge voltage
and Pulse duration Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 32 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 14. 5.3.2.4 Voltage surges imported into EDUT, 40 VDC surge with 20 mΩ source impedance, Pulse period
Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 33 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 15. 5.3.2.4 Voltage surges imported into EDUT, 100 VDC surge with 500 mΩ source impedance, Surge voltage
and Pulse duration Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 34 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 16. 5.3.2.4 Voltage surges imported into EDUT, 100 VDC surge with 500 mΩ source impedance, Pulse period
Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 35 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 17. 5.3.2.4 Voltage surges imported into EDUT, 40 VDC Surge Test Results
Trace 1
Trace 3
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 36 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 18. 5.3.2.4 Voltage surges imported into EDUT, 100 VDC Surge Test Results
Trace 1
Trace 3
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
: INPUT
: OUTPUT
© 2014, MET Laboratories, Inc.
Page 37 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
5.3.2.4: Ripple voltage imported into EDUT
Test Requirement(s):
The ripple voltage imposed shall not damage the EDUT components nor affect the normal
operation of the EDUT. Any deviation from normal operation, even an intermittent anomaly,
such that it eventually returns to normal operation, is recognized as a failure of the EDUT.
The regular and/or irregular variations of voltage about a fixed DC voltage level during steady
state operation of a DC system. The upper and lower ripple limits are called “Upper Peak of the
Ripple Voltage” and “Lower Peak of the Ripple Voltage”, respectively.
Figure 7. 5.3.2.4: Ripple voltage imported into EDUT
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 38 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Test Procedures:
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
A Digital Phosphorus Oscilloscope was used to monitor the ripple onto the EDUT power
terminals. Using the test methods from SAE J1113-2, simulated ripple voltage of a sinusoidal
waveform was applied to the EDUT power lead(s), while it was operating over its specified
range of functions, in order to demonstrate indefinite immunity to ripple voltage over the
frequency range of 50 Hz to 200 kHz. The upper and lower peaks of ripple voltage were 7V
from the generator-only steady state voltage limits; thus, by default, the lower Normal Mode test
limits were covered. The EDUT was tested for a minimum of 1 minute at each ripple voltage
frequency: 50Hz, 12 kHz, 48 kHz, and 200 kHz.
The source impedance of the transformer was verified as described in Appendix A of SAE
J1113-2.
Source Impedance: Z = 0.429 ohm
VOC = 13V
VCC = 7V
RL = 0.5ohm
Test Results:
The EDUT was compliant with the specifications of MIL-STD-1275D, Section 5.3.2.4
Test Engineer(s):
Joseph Dizon
Test Date(s):
07/30/2014
Frequency
50 Hz
12 kHz
48 kHz
200 kHz
Test Level
14 Vpp
14 Vpp
14 Vpp
14 Vpp
Dwell Time
1 minute
1 minute
1 minute
1 minute
No
No
No
No
Notes
Anomalies Observed
Anomalies Observed
Anomalies Observed
Anomalies Observed
Table 13. Ripple voltage imported into EDUT Test Results
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 39 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 19. 5.3.2.4 Ripple voltage imported into EDUT, 50 Hz Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 40 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 20. 5.3.2.4 Ripple voltage imported into EDUT, 12 kHz Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 41 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 21. 5.3.2.4 Ripple voltage imported into EDUT, 48 kHz Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 42 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 22. 5.3.2.4 Ripple voltage imported into EDUT, 200 kHz Calibration
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 43 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 23. 5.3.2.4 Ripple voltage imported into EDUT, 50 Hz Test Results
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 44 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 24. 5.3.2.4 Ripple voltage imported into EDUT, 12 kHz Test Results
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 45 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 25. 5.3.2.4 Ripple voltage imported into EDUT, 48 kHz Test Results
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 46 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility Criteria
MIL-STD-1275D
Plot 26. 5.3.2.4 Ripple voltage imported into EDUT, 200 kHz Test Result
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 47 of 49
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Ele ctromagnetic Compatibility
Te st Equipment
MIL-STD-1275D
IV. Test Equipment
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 48 of 49
Ele ctromagnetic Compatibility
Te st Equipment
MIL-STD-1275D
Linear Te chnology Corporation
LTC4366/LT4363 MIL-STD-1275D Surge Stoppe r Model DC2150A-C
Test Equipment
Calibrated test equipment utilized during testing was maintained in a current state of calibration per the requirements of
ANSI/NCSL Z540-1-1994 and ANSI/ISO/IEC 17025:2000.
Te st Name: 4.3 EDUT Compatibility
Te st Date (s): 07/29/2014
MET Asse t #
Nome nclature
Manufacture r
Mode l
Last Cal Date
Cal Due Date
1S2544
LISN
Solar Electronics
9233-50-T S-50-N
12/16/2013
06/16/2015
12/16/2013
06/16/2015
1S2545
LISN
Solar Electronics
9233-50-T S-50-N
1T 4754
DC Power Supply
Chroma
62006P-300-8
1S3812
Oscilloscope
Agilent
54845A
05/08/2014
11/08/2015
4S3782
Differential Probe
Sapphire Instruments
SI 9101
10/21/2013
04/21/2015
1S3831
Passive High Voltage Probe
T ektronix
P5100A
See Note
See Note
1S2636
Digital Micro-Ohmmeter
NDB T echnologies
DRM-1A
01/31/2014
07/31/2015
1S3795
T hermal Clock & Humidity Monitor
T raceable Fisher Scientific
06-662-4, FB70258
11/27/2012
11/27/2014
4S3777
High Voltage Differential Probe
Cal T est
SI-9010
10/14/2013
04/14/2015
Last Cal Date
Cal Due Date
Te st Name: 5.1.2 Starting Mode
Te st Date (s): 07/30/2014
MET Asse t #
Nome nclature
Manufacture r
1S2634
Variable Power Supply
Ametek
1T 4754
DC Power Supply
Chroma
Mode l
MX30-480-160-704A350-ABD-AMD-HF
62006P-300-8
1S3812
Oscilloscope
Agilent
54845A
05/08/2014
11/08/2015
4S3782
Differential Probe
Sapphire Instruments
SI 9101
10/21/2013
04/21/2015
1S3831
Passive High Voltage Probe
T ektronix
P5100A
1S2636
Digital Micro-Ohmmeter
NDB T echnologies
DRM-1A
01/31/2014
07/31/2015
1S3795
T hermal Clock & Humidity Monitor
T raceable Fisher Scientific
06-662-4, FB70258
11/27/2012
11/27/2014
4S3777
High Voltage Differential Probe
Cal T est
SI-9010
10/14/2013
04/14/2015
Last Cal Date
Cal Due Date
Te st Name: 5.3.2 Ve hicle Equipment
See Note
See Note
See Note
Te st Date (s): 07/30/2014
MET Asse t #
Nome nclature
Manufacture r
Mode l
1T 4754
DC Power Supply
Chroma
62006P-300-8
See Note
1S3812
Oscilloscope
Agilent
54845A
05/08/2014
11/08/2015
4S3782
Differential Probe
Sapphire Instruments
SI 9101
10/21/2013
04/21/2015
1S3831
Passive High Voltage Probe
T ektronix
P5100A
1S2636
Digital Micro-Ohmmeter
NDB T echnologies
DRM-1A
01/31/2014
07/31/2015
1S3795
T hermal Clock & Humidity Monitor
T raceable Fisher Scientific
06-662-4, FB70258
11/27/2012
11/27/2014
4S3777
High Voltage Differential Probe
T est Fixture: MIL-ST D-1275
Exported Spike T est
Cal T est
SI-9010
10/14/2013
04/14/2015
MET Laboratories
NA
1T 4716
See Note
See Note
Table 14. Detailed List of Test Equipment
Note: Functionally verified test equipment is verified using calibrated instrumentation at the time of testing.
MET Re port: EMCS42676-MIL
DOC-EMC1301 8/22/2008
© 2014, MET Laboratories, Inc.
Page 49 of 49
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