STK11C68-5 (SMD5962-92324) 64 Kbit (8 K x 8) SoftStore nvSRAM Features Functional Description ■ 35 ns, 45 ns, and 55 ns access times ■ Pin compatible with industry standard SRAMs ■ Software initiated nonvolatile STORE ■ Unlimited Read and Write endurance ■ Automatic RECALL to SRAM on power-up ■ Unlimited RECALL cycles ■ 1,000,000 STORE cycles The Cypress STK11C68-5 is a 64 Kb fast static RAM with a nonvolatile element in each memory cell. The embedded nonvolatile elements incorporate QuantumTrap technology to produce the world’s most reliable nonvolatile memory. The SRAM provides unlimited read and write cycles, while independent nonvolatile data resides in the highly reliable QuantumTrap cell. Data transfers under software control from SRAM to the nonvolatile elements (the STORE operation). On power-up, data is automatically restored to the SRAM (the RECALL operation) from the nonvolatile memory. RECALL operations are also available under software control. ■ 100 year data retention For a complete list of related documentation, click here. ■ Single 5 V ± 10% operation ■ Military temperature ■ 28-pin (300 mil) CDIP and 28-pad LCC packages Logic Block Diagram A5 A7 A8 A9 A 11 STATIC RAM ARRAY 128 X 512 RECALL STORE/ RECALL CONTROL DQ 0 DQ 4 DQ 5 DQ 6 A0 - A12 COLUMN I/O COLUMN DEC INPUT BUFFERS DQ 2 DQ 3 HSB SOFTWARE DETECT A 12 DQ 1 VCAP POWER CONTROL STORE ROW DECODER A6 VCC Quantum Trap 128 X 512 A 0 A 1 A 2 A 3 A 4 A 10 DQ 7 OE CE WE Cypress Semiconductor Corporation Document Number: 001-51001 Rev. *E • 198 Champion Court • San Jose, CA 95134-1709 • 408-943-2600 Revised April 2, 2015 STK11C68-5 (SMD5962-92324) Contents Pinouts .............................................................................. Pin Definitions .................................................................. Device Operation .............................................................. SRAM Read ....................................................................... SRAM Write ....................................................................... Software STORE ............................................................... Software RECALL............................................................. Hardware RECALL (Power Up)........................................ Hardware Protect.............................................................. Noise Considerations....................................................... Low Average Active Power.............................................. Best Practices................................................................... Maximum Ratings............................................................. Operating Range .............................................................. DC Electrical Characteristics .......................................... Data Retention and Endurance ....................................... Capacitance ...................................................................... Document Number: 001-51001 Rev. *E 3 3 4 4 4 4 4 4 4 4 5 5 6 6 6 6 6 Thermal Resistance.......................................................... 7 AC Test Conditions .......................................................... 7 SRAM Read Cycle ...................................................... 8 SRAM Write Cycle....................................................... 9 AutoStore INHIBIT or Power Up RECALL .................... 10 Software Controlled STORE/RECALL Cycle................ 11 Part Numbering Nomenclature...................................... 12 Ordering Information...................................................... 13 Acronyms ........................................................................ 16 Document Conventions ................................................. 16 Units of Measure ....................................................... 16 Document History Page ................................................ 17 Sales, Solutions, and Legal Information ...................... 18 Worldwide Sales and Design Support....................... 18 Products .................................................................... 18 PSoC Solutions ......................................................... 18 Page 2 of 18 STK11C68-5 (SMD5962-92324) Pinouts Figure 1. Pin Diagram - 28-Pin CDIP NC 1 28 VCC A12 2 27 A7 3 26 WE NC A6 4 25 A8 A5 5 24 A9 A4 6 23 A 11 A3 7 A2 8 A1 22 OE 21 A 10 9 20 A0 10 19 CE DQ 7 DQ0 11 18 DQ 6 DQ1 12 17 DQ 5 DQ2 13 16 DQ4 VSS 14 15 DQ3 (TOP) Figure 2. Pin Diagram - 28-Pin LCC Pin Definitions Pin Name Alt A0–A12 I/O Type Input DQ0-DQ7 Description Address Inputs. Used to select one of the 8,192 bytes of the nvSRAM. Input/Output Bidirectional Data I/O Lines. Used as input or output lines depending on operation. WE W Input Write Enable Input, Active LOW. When the chip is enabled and WE is LOW, data on the I/O pins is written to the specific address location. CE E Input Chip Enable Input, Active LOW. When LOW, selects the chip. When HIGH, deselects the chip. OE G Input Output Enable, Active LOW. The active LOW OE input enables the data output buffers during read cycles. Deasserting OE HIGH causes the I/O pins to tristate. VSS VCC Ground Ground for the Device. The device is connected to ground of the system. Power Supply Power Supply Inputs to the Device. Document Number: 001-51001 Rev. *E Page 3 of 18 STK11C68-5 (SMD5962-92324) Device Operation The STK11C68-5 (SMD5962-92324) is a versatile memory chip that provides several modes of operation. The STK11C68-5 (SMD5962-92324) can operate as a standard 8K x 8 SRAM. It has an 8K x 8 Nonvolatile Elements shadow to which the SRAM information can be copied or from which the SRAM can be updated in nonvolatile mode. SRAM Read The STK11C68-5 (SMD5962-92324) performs a Read cycle whenever CE and OE are LOW while WE is HIGH. The address specified on pins A0–12 determines the 8,192 data bytes accessed. When the Read is initiated by an address transition, the outputs are valid after a delay of tAA (Read cycle 1). If the Read is initiated by CE or OE, the outputs are valid at tACE or at tDOE, whichever is later (Read cycle 2). The data outputs repeatedly respond to address changes within the tAA access time without the need for transitions on any control input pins. They remain valid until another address change or until CE or OE is brought HIGH, or WE is brought LOW. SRAM Write A Write cycle is performed whenever CE and WE are LOW. The address inputs must be stable before entering the Write cycle and must remain stable until either CE or WE goes HIGH at the end of the cycle. The data on the common I/O pins DQ0–7 are written into the memory if it has valid tSD. This is done before the end of a WE controlled Write or before the end of an CE controlled Write. Keep OE HIGH during the entire Write cycle to avoid data bus contention on common I/O lines. If OE is left LOW, internal circuitry turns off the output buffers tHZWE after WE goes LOW. Software STORE Data is transferred from the SRAM to the nonvolatile memory by a software address sequence. The STK11C68-5 (SMD5962-92324) software STORE cycle is initiated by executing sequential CE controlled Read cycles from six specific address locations in exact order. During the STORE cycle, an erase of the previous nonvolatile data is first performed followed by a program of the nonvolatile elements. When a STORE cycle is initiated, input and output are disabled until the cycle is completed. Because a sequence of Reads from specific addresses is used for STORE initiation, it is important that no other Read or Write accesses intervene in the sequence. If they intervene, the sequence is aborted and no STORE or RECALL takes place. To initiate the software STORE cycle, the following Read sequence is performed: 1. Read address 0x0000, Valid READ 2. Read address 0x1555, Valid READ 3. Read address 0x0AAA, Valid READ 4. Read address 0x1FFF, Valid READ 5. Read address 0x10F0, Valid READ 6. Read address 0x0F0F, Initiate STORE cycle Document Number: 001-51001 Rev. *E The software sequence is clocked with CE controlled Reads. When the sixth address in the sequence is entered, the STORE cycle commences and the chip is disabled. It is important that Read cycles and not Write cycles are used in the sequence. It is not necessary that OE is LOW for a valid sequence. After the tSTORE cycle time is fulfilled, the SRAM is again activated for Read and Write operation. Software RECALL Data is transferred from the nonvolatile memory to the SRAM by a software address sequence. A software RECALL cycle is initiated with a sequence of Read operations in a manner similar to the software STORE initiation. To initiate the RECALL cycle, the following sequence of CE controlled Read operations is performed: 1. Read address 0x0000, Valid READ 2. Read address 0x1555, Valid READ 3. Read address 0x0AAA, Valid READ 4. Read address 0x1FFF, Valid READ 5. Read address 0x10F0, Valid READ 6. Read address 0x0F0E, Initiate RECALL cycle Internally, RECALL is a two step procedure. First, the SRAM data is cleared; then, the nonvolatile information is transferred into the SRAM cells. After the tRECALL cycle time, the SRAM is again ready for Read and Write operations. The RECALL operation does not alter the data in the nonvolatile elements. The nonvolatile data can be recalled for an unlimited number of times. Hardware RECALL (Power Up) During power up or after any low-power condition (VCC < VRESET), an internal RECALL request is latched. When VCC once again exceeds the sense voltage of VSWITCH, a RECALL cycle is automatically initiated and takes tHRECALL to complete. If the STK11C68-5 (SMD5962-92324) is in a Write state at the end of power-up RECALL, the SRAM data is corrupted. To help avoid this situation, a 10 k resistor is connected either between WE and system VCC or between CE and system VCC. Hardware Protect The STK11C68-5 (SMD5962-92324) offers hardware protection against inadvertent STORE operation and SRAM Writes during low voltage conditions. When VCAP < VSWITCH, all externally initiated STORE operations and SRAM Writes are inhibited. Noise Considerations The STK11C68-5 (SMD5962-92324) is a high-speed memory. It must have a high frequency bypass capacitor of approximately 0.1 µF connected between VCC and VSS, using leads and traces that are as short as possible. As with all high-speed CMOS ICs, careful routing of power, ground, and signals reduce circuit noise. Page 4 of 18 STK11C68-5 (SMD5962-92324) Low Average Active Power Figure 4. Current Versus Cycle Time (Write) CMOS technology provides the STK11C68-5 (SMD5962-92324) the benefit of drawing significantly less current when it is cycled at times longer than 50 ns. Figure 3 and Figure 4 shows the relationship between ICC and Read or Write cycle time. Worst case current consumption is shown for both CMOS and TTL input levels (commercial temperature range, VCC = 5.5 V, 100% duty cycle on chip enable). Only standby current is drawn when the chip is disabled. The overall average current drawn by the STK11C68-5 (SMD5962-92324) depends on the following items: ■ Duty cycle of chip enable ■ Overall cycle rate for accesses ■ Ratio of Reads to Writes ■ CMOS versus TTL input levels ■ Operating temperature ■ VCC level Best Practices Cypress nvSRAM products have been used effectively for over 15 years. While ease of use is one of the product’s main system values, the experience gained from working with hundreds of applications has resulted in the following suggestions as best practices: ■ The nonvolatile cells in an nvSRAM are programmed on the test floor during final test and quality assurance. Incoming inspection routines at customer or contract manufacturer’s sites sometimes reprograms these values. Final NV patterns are typically repeating patterns of AA, 55, 00, FF, A5, or 5A. The end product’s firmware must not assume that an NV array is in a set programmed state. Routines that check memory content values to determine first time system configuration. ■ Cold or warm boot status, and so on must always program a unique NV pattern (for example, complex 4-byte pattern of 46 E6 49 53 hex or more random bytes) as part of the final system manufacturing test. This is to ensure these system routines work consistently. I/O loading Figure 3. Current Versus Cycle Time (Read) ■ Table 1. Hardware Mode Selection CE WE A12–A0 Mode I/O Notes L H 0x0000 0x1555 0x0AAA 0x1FFF 0x10F0 0x0F0F Read SRAM Read SRAM Read SRAM Read SRAM Read SRAM Nonvolatile STORE Output Data Output Data Output Data Output Data Output Data Output High Z [1] L H 0x0000 0x1555 0x0AAA 0x1FFF 0x10F0 0x0F0E Read SRAM Read SRAM Read SRAM Read SRAM Read SRAM Nonvolatile RECALL Output Data Output Data Output Data Output Data Output Data Output High Z [1] Note 1. The six consecutive addresses must be in the order listed. WE must be high during all six consecutive CE controlled cycles to enable a nonvolatile cycle. Document Number: 001-51001 Rev. *E Page 5 of 18 STK11C68-5 (SMD5962-92324) Maximum Ratings Voltage on DQ0-7 ................................ –0.5 V to VCC + 0.5 V Exceeding maximum ratings may shorten the useful life of the device. These user guidelines are not tested. Storage Temperature ............................... –65 C to +150 C Power Dissipation ........................................................ 1.0 W DC Output Current (1 output at a time, 1s duration).... 15 mA Operating Range Temperature under bias............................ –55 C to +125 C Supply Voltage on VCC Relative to GND ........–0.5 V to 7.0 V Range Voltage on Input Relative to VSS ......... –0.6 V to VCC + 0.5 V Military Ambient Temperature VCC -55 C to +125 C 4.5 V to 5.5 V DC Electrical Characteristics Over the operating range (VCC = 4.5 V to 5.5 V) Test Conditions Min Max Unit ICC1 Parameter Average VCC current Description tRC = 35 ns tRC = 45 ns tRC = 55 ns Dependent on output loading and cycle rate. Values obtained without output loads. IOUT = 0 mA – 75 65 55 mA mA mA ICC2 Average VCC current during STORE All Inputs Do Not Care, VCC = Max Average current for duration tSTORE – 3 mA ICC3 Average VCC current at WE > (VCC – 0.2 V). All other inputs cycling. tRC= 200 ns, 5 V, 25 °C Dependent on output loading and cycle rate. Values obtained Typical without output loads. – 10 mA ISB1[2] VCC standby current (Standby, Cycling TTL Input Levels) tRC = 35 ns, CE > VIH tRC = 45 ns, CE > VIH tRC = 55 ns, CE > VIH – 24 21 20 mA mA mA ISB2 [2] VCC standby current CE > (VCC – 0.2 V). All others VIN < 0.2 V or > (VCC – 0.2 V). Standby current level after nonvolatile cycle is complete. Inputs are static. f = 0 MHz – 1500 A IIX Input leakage current VCC = Max, VSS < VIN < VCC –1 +1 A IOZ Off state output Leakage current VCC = Max, VSS < VIN < VCC, CE or OE > VIH or WE < VIL –5 +5 A VIH Input HIGH voltage 2.2 VCC + 0.5 V VIL Input LOW voltage VSS – 0.5 0.8 V VOH Output HIGH voltage IOUT = –4 mA 2.4 – V VOL Output LOW voltage IOUT = 8 mA – 0.4 V Data Retention and Endurance Parameter Description DATAR Data retention NVC Nonvolatile STORE operations Min Unit 100 Years 1,000 K Max Unit 8 pF 7 pF Capacitance In this table, the capacitance parameters are listed.[3] Parameter Description CIN Input capacitance COUT Output capacitance Test Conditions TA = 25 C, f = 1 MHz, VCC = 0 to 3.0 V Note 2. CE > VIH does not produce standby current levels until any nonvolatile cycle in progress has timed out. 3. These parameters are guaranteed by design and are not tested. Document Number: 001-51001 Rev. *E Page 6 of 18 STK11C68-5 (SMD5962-92324) Thermal Resistance In this table, the thermal resistance parameters are listed.[4] Parameter Description JA Thermal resistance (junction to ambient) JC Thermal resistance (junction to case) Test Conditions 28-CDIP 28-LCC Unit Test conditions follow standard test methods and procedures for measuring thermal impedance, per EIA / JESD51. TBD TBD C/W TBD TBD C/W Figure 5. AC Test Loads R1 480 5.0 V Output 30 pF R2 255 AC Test Conditions Input Pulse Levels .................................................. 0 V to 3 V Input Rise and Fall Times (10% to 90%) ...................... <5 ns Input and Output Timing Reference Levels ................... 1.5 V Note 4. These parameters are guaranteed by design and are not tested. Document Number: 001-51001 Rev. *E Page 7 of 18 STK11C68-5 (SMD5962-92324) AC Switching Characteristics SRAM Read Cycle Parameter Cypress Alt Parameter tELQV tACE [5] tAVAV, tRC tELEH tAVQV tAA [6] 35 ns Description 45 ns 55 ns Unit Min Max Min Max Min Max Chip enable access time Read cycle time – 35 35 – – 45 45 – – 55 55 – ns ns Address access time – 35 – 45 – 55 ns tGLQV tAXQX Output enable to data valid Output hold after address change – 5 15 – – 5 20 – – 5 35 – ns ns tLZCE [7] tELQX Chip enable to output active 5 – 5 – 5 – ns tHZCE [7] tEHQZ Chip disable to output inactive – 13 – 15 – 25 ns tLZOE [7] tGLQX Output enable to output active 0 – 0 – 0 – ns tHZOE [7] – 13 – 15 – 25 ns tDOE tOHA [6] tGHQZ Output disable to output inactive tPU [8] tELICCH Chip enable to power active 0 – 0 – 0 – ns tPD [8] tEHICCL Chip disable to power standby – 35 – 45 – 55 ns Switching Waveforms Figure 6. SRAM Read Cycle 1: Address Controlled [5, 6] tRC ADDRESS t AA tOHA DQ (DATA OUT) DATA VALID Figure 7. SRAM Read Cycle 2: CE and OE Controlled [5] tRC ADDRESS tLZCE CE tACE tPD tHZCE OE tLZOE DQ (DATA OUT) t PU ICC tHZOE tDOE DATA VALID ACTIVE STANDBY Notes 5. WE must be High during SRAM Read cycles. 6. I/O state assumes CE and OE < VIL and WE > VIH; device is continuously selected. 7. Measured ± 200 mV from steady state output voltage. 8. These parameters are guaranteed by design and are not tested. Document Number: 001-51001 Rev. *E Page 8 of 18 STK11C68-5 (SMD5962-92324) SRAM Write Cycle Parameter Cypress Alt Parameter tAVAV tWC tWLWH, tWLEH tPWE tELWH, tELEH tSCE tSD tDVWH, tDVEH tWHDX, tEHDX tHD tAVWH, tAVEH tAW tSA tAVWL, tAVEL tWHAX, tEHAX tHA [9,10] t tHZWE WLQZ tLZWE [9] tWHQX 35 ns Description 45 ns 55 ns Unit Min Max Min Max Min Max Write cycle time Write pulse width Chip enable to end of write Data setup to end of write Data hold after end of write Address setup to end of write Address setup to start of write Address hold after end of write Write enable to output disable 35 25 25 12 0 25 0 0 – – – – – – – – – 13 45 30 30 15 0 30 0 0 – – – – – – – – – 15 55 45 45 30 0 45 0 0 – – – – – – – – – 35 ns ns ns ns ns ns ns ns ns Output active after end of write 5 – 5 – 5 – ns Switching Waveforms Figure 8. SRAM Write Cycle 1: WE Controlled [10, 11] tWC ADDRESS tHA tSCE CE tAW tSA tPWE WE tSD tHD DATA VALID DATA IN tHZWE DATA OUT tLZWE HIGH IMPEDANCE PREVIOUS DATA Figure 9. SRAM Write Cycle 2: CE and OE Controlled [10, 11] tWC ADDRESS CE WE tHA tSCE tSA tAW tPWE tSD DATA IN DATA OUT tHD DATA VALID HIGH IMPEDANCE Notes 9. Measured ± 200 mV from steady state output voltage. 10. If WE is Low when CE goes Low, the outputs remain in the high impedance state. 11. CE or WE must be greater than VIH during address transitions. Document Number: 001-51001 Rev. *E Page 9 of 18 STK11C68-5 (SMD5962-92324) AutoStore INHIBIT or Power Up RECALL Parameter Alt STK11C68-5 (SMD5962-92324) Description Min Max Unit tHRECALL [12] tRESTORE Power up RECALL duration – 550 s tSTORE STORE cycle duration – 10 ms 4.0 4.5 V – 3.6 V tHLHZ VSWITCH Low voltage trigger level VRESET Low voltage reset level Figure 10. AutoStore INHIBIT/Power Up RECALL VCC 5V VSWITCH VRESET STORE INHIBIT POWER-UP RECALL tHRECALL DQ (DATA OUT) POWER-UP RECALL BROWN OUT STORE INHIBIT BROWN OUT STORE INHIBIT BROWN OUT STORE INHIBIT NO RECALL (VCC DID NOT GO BELOW VRESET) NO RECALL (VCC DID NOT GO BELOW VRESET) RECALL WHEN VCC RETURNS ABOVE VSWITCH Notes 12. tHRECALL starts from the time VCC rises above VSWITCH. Document Number: 001-51001 Rev. *E Page 10 of 18 STK11C68-5 (SMD5962-92324) Software Controlled STORE/RECALL Cycle The software controlled STORE/RECALL cycle follows. [13, 14] Parameter Alt Description 35 ns Min 45 ns Max Min 55 ns Max Min Max Unit tRC tAVAV STORE/RECALL initiation cycle time 35 – 45 – 55 – ns tSA[13] tCW[13] tHACE[13] tRECALL[13] tAVEL Address setup time 0 – 0 – 0 – ns tELEH Clock pulse width 25 – 30 – 35 – ns tELAX Address hold time 20 – 20 – 20 – ns RECALL duration – 20 – 20 – 20 s Switching Waveform Figure 11. CE Controlled Software STORE/RECALL Cycle [13] tRC ADDRESS # 1 ADDRESS tSA tRC ADDRESS # 6 tSCE CE tHACE OE t STORE / t RECALL DQ (DATA) DATA VALID DATA VALID HIGH IMPEDANCE Notes 13. The software sequence is clocked on the falling edge of CE without involving OE (double clocking aborts the sequence). 14. The six consecutive addresses must be read in the order listed in Table 1 on page 5. WE must be HIGH during all six consecutive cycles. Document Number: 001-51001 Rev. *E Page 11 of 18 STK11C68-5 (SMD5962-92324) Part Numbering Nomenclature STK11C68 - 5 C 45 M Temperature Range: M - Military (-55 to 125 °C) Speed: 35 - 35 ns 45 - 45 ns 55 - 55 ns Package: C = Ceramic 28-pin 300 mil DIP (gold lead finish) K = Ceramic 28-pin 300 mil DIP (Solder dip finish) L = Ceramic 28-pin LCC Retention / Endurance 5 = Military (10 years or 105 cycles) SMD5962-92324 04 MX X Lead Finish A = Solder DIP lead finish C = Gold lead DIP finish X = Lead finish “A” or “C” is acceptable Case Outline X = Ceramic 28-pin 300 mil DIP Y = Ceramic 28-pin LCC Device Class Indicator - Class M Device Type: 04 = 55 ns 05 = 45 ns 06 = 35 ns Document Number: 001-51001 Rev. *E Page 12 of 18 STK11C68-5 (SMD5962-92324) Ordering Information Speed (ns) Ordering Code Package Diagram Package Type 35 STK11C68-5L35M 001-51696 28-Pin LCC (350 mil) 55 STK11C68-5C55M 001-51695 28-Pin CDIP (300 mil) Operating Range Military This table contains Final information. Contact your local Cypress sales representative for availability of these parts. Document Number: 001-51001 Rev. *E Page 13 of 18 STK11C68-5 (SMD5962-92324) Package Diagrams Figure 12. 28-Pin (300-Mil) Side Braze DIP (001-51695) 001-51695 *C Document Number: 001-51001 Rev. *E Page 14 of 18 STK11C68-5 (SMD5962-92324) Package Diagrams (continued) Figure 13. 28-Pad (350-Mil) LCC (001-51696) 001-51696 *C Document Number: 001-51001 Rev. *E Page 15 of 18 STK11C68-5 (SMD5962-92324) Acronyms Document Conventions Acronym Description Units of Measure CE chip enable CMOS complementary metal oxide semiconductor °C degrees Celsius I/O input/output k kilohm I/O input/output A microampere nvSRAM nonvolatile static random access memory mA milliampere OE output enable F microfarad SRAM static random access memory s microsecond TTL transistor-transistor logic ms millisecond WE write enable ns nanosecond pF picofarad V volt ohm W watt Document Number: 001-51001 Rev. *E Symbol Unit of Measure Page 16 of 18 STK11C68-5 (SMD5962-92324) Document History Page Document Title: STK11C68-5 (SMD5962-92324) 64 Kbit (8 K x 8) SoftStore nvSRAM Document Number: 001-51001 Rev. ECN No. Orig. of Change Submission Date Description of Change ** 2666844 GVCH/PYRS 03/02/2009 New data sheet *A 2685053 GVCH 04/07/2009 Added part numbers: STK11C68-5K45M and STK11C68-5K55M *B 3054310 GVCH/KEER 10/1120/10 Removed inactive parts - STK11C68-5C35M, STK11C68-5K35M, STK11C68-5C45M, STK11C68-5K45M, STK11C68-5L45M from Ordering Code Information table. Updated Package diagrams. *C 3527665 GVCH 02/16/2012 Added Acronyms, Document Conventions, and Table of Contents. Completing sunset review. *D 4568935 GVCH 11/14/2014 Added documentation related hyperlink in page 1 Removed 02pruned parts - STK11C68-5K55M, STK11C68-5L55M Updated package diagrams from 001-51695*A to 001-51695*B and 001-51696*A to 001-51696*B *E 4706588 GVCH 04/02/2015 Updated package diagrams from 001-51695*B to 001-51695*C and 001-51696*B to 001-51696*C Document Number: 001-51001 Rev. *E Page 17 of 18 STK11C68-5 (SMD5962-92324) Sales, Solutions, and Legal Information Worldwide Sales and Design Support Cypress maintains a worldwide network of offices, solution centers, manufacturer’s representatives, and distributors. To find the office closest to you, visit us at Cypress Locations. Products Automotive Clocks & Buffers Interface Lighting & Power Control PSoC Solutions cypress.com/go/automotive cypress.com/go/clocks psoc.cypress.com/solutions cypress.com/go/interface PSoC 1 | PSoC 3 | PSoC 5 cypress.com/go/powerpsoc cypress.com/go/plc Memory Optical & Image Sensing PSoC Touch Sensing cypress.com/go/memory cypress.com/go/image cypress.com/go/psoc cypress.com/go/touch USB Controllers Wireless/RF cypress.com/go/USB cypress.com/go/wireless © Cypress Semiconductor Corporation, 2009-2015. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress’ product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. Document Number: 001-51001 Rev. *E Revised April 2, 2015 Page 18 of 18 AutoStore and QuantumTrap are registered trademarks of Cypress Semiconductor Corporation. All products and company names mentioned in this document may be the trademarks of their respective holders.