INFINEON Q62702

Silicon N Channel MOSFET Tetrode
BF 998
Features
●
Short-channel transistor
with high S/C quality factor
●
For low-noise, gain-controlled
input stages up to 1 GHz
Type
Marking
Ordering Code
(tape and reel)
Pin Configuration
1
2
3
4
Package1)
BF 998
MO
Q62702-F1129
S
SOT-143
D
G2
G1
Maximum Ratings
Parameter
Symbol
Values
Unit
Drain-source voltage
VDS
12
V
Drain current
ID
30
mA
Gate 1/gate 2 peak source current
±
10
Total power dissipation, TS < 76 ˚C
Ptot
200
Storage temperature range
Tstg
– 55 … + 150 ˚C
Channel temperature
Tch
150
Rth JS
< 370
IG1/2SM
mW
Thermal Resistance
Junction - soldering point
1)
K/W
For detailed information see chapter Package Outlines.
Semiconductor Group
1
04.96
BF 998
Electrical Characteristics
at TA = 25 ˚C, unless otherwise specified.
Parameter
Symbol
Values
Unit
min.
typ.
max.
DC Characteristics
Drain-source breakdown voltage
ID = 10 µA, – VG1S = – VG2S = 4 V
V(BR) DS
12
–
–
Gate 1-source breakdown voltage
± IG1S = 10 mA, VG2S = VDS = 0
± V(BR) G1SS
8
–
12
Gate 2-source breakdown voltage
± IG2S = 10 mA, VG1S = VDS = 0
± V(BR) G2SS
8
–
12
Gate 1-source leakage current
± VG1S = 5 V, VG2S = VDS = 0
± IG1SS
–
–
50
Gate 2-source leakage current
± VG2S = 5 V, VG1S = VDS = 0
± IG2SS
–
–
50
Drain current
VDS = 8 V, VG1S = 0, VG2S = 4 V
IDSS
2
–
18
mA
Gate 1-source pinch-off voltage
VDS = 8 V, VG2S = 4 V, ID = 20 µA
– VG1S(p)
–
–
2.5
V
Gate 2-source pinch-off voltage
VDS = 8 V, VG1S = 0, ID = 20 µA
– VG2S(p)
–
–
2
Semiconductor Group
2
V
nA
BF 998
Electrical Characteristics
at TA = 25 ˚C, unless otherwise specified.
Parameter
Values
Symbol
Unit
min.
typ.
max.
AC Characteristics
Forward transconductance
VDS = 8 V, ID = 10 mA, VG2S = 4 V
f = 1 kHz
gfs
–
24
–
mS
Gate 1 input capacitance
VDS = 8 V, ID = 10 mA, VG2S = 4 V
f = 1 MHz
Cg1ss
–
2.1
2.5
pF
Gate 2 input capacitance
VDS = 8 V, ID = 10 mA, VG2S = 4 V
f = 1 MHz
Cg2ss
–
1.2
–
Reverse transfer capacitance
VDS = 8 V, ID = 10 mA, VG2S = 4 V
f = 1 MHz
Cdg1
–
25
–
fF
Output capacitance
VDS = 8 V, ID = 10 mA, VG2S = 4 V
f = 1 MHz
Cdss
–
1.05
–
pF
Power gain
(test circuit 1)
VDS = 8 V, ID = 10 mA, f = 200 MHz,
GG = 2 mS, GL = 0.5 mS, VG2S = 4 V
Gps
–
28
–
dB
Power gain
(test circuit 2)
VDS = 8 V, ID = 10 mA, f = 800 MHz,
GG = 3.3 mS, GL = 1 mS, VG2S = 4 V
Gps
–
20
–
Noise figure
(test circuit 1)
VDS = 8 V, ID = 10 mA, f = 200 MHz,
GG = 2 mS, GL = 0.5 mS, VG2S = 4 V
F
–
0.6
–
Noise figure
(test circuit 2)
VDS = 8 V, ID = 10 mA, f = 800 MHz,
GG = 3.3 mS, GL = 1 mS, VG2S = 4 V
F
–
1
–
Control range
(test circuit 2)
VDS = 8 V, VG2S = 4 … – 2 V
f = 800 MHz
∆Gps
40
–
–
Semiconductor Group
3
dB
BF 998
Total power dissipation Ptot = f (TA)
Output characteristics ID = f (VDS)
VG2S = 4 V
Gate 1 forward transconductance
gfs1 = f (VG1S)
VDS = 8 V, IDSS = 10 mA, f = 1 kHz
Gate 1 forward transconductance
gfs1 = f (VG2S)
VDS = 8 V, IDSS = 10 mA, f = 1 kHz
Semiconductor Group
4
BF 998
Gate 1 forward transconductance
gfs1 = f (ID)
VDS = 8 V, IDSS = 10 mA, f = 1 kHz
Gate 1 input capacitance Cg1ss = f (VG1S)
VG2S = 4 V, VDS = 8 V, IDSS = 10 mA,
f = 1 MHz
Gate 2 input capacitance C g2ss = f (VG2S)
VG1S = 0 V, VDS = 8 V
IDSS = 10 mA, f = 1 MHz
Output capacitance Cdss = f (VDS)
VG1S = 0 V, VG2S = 4 V
IDSS = 10 mA, f = 1 MHz
Semiconductor Group
5
BF 998
Drain current ID = f (VG1S)
VDS = 8 V
Power gain Gps = f (VG2S)
VDS = 8 V, VG1S = 0, IDSS = 10 mA,
f = 200 MHz (see test circuit 1)
Noise figure F = f (VG2S)
VDS = 8 V, VG1S = 0, IDSS = 10 mA,
f = 200 MHz (see test circuit 1)
Power gain Gps = f (VG2S)
VDS = 8 V, VG1S = 0, IDSS = 10 mA,
f= 800 MHz (see test circuit 2)
Semiconductor Group
6
BF 998
Noise figure F = f (VG2S)
VDS = 8 V, VG1S = 0, IDSS = 10 mA,
f = 800 MHz (see test circuit 2)
Gate 1 input admittance y11s
VDS = 8 V, VG2S = 4 V, VG1S = 0,
IDSS = 10 mA (common-source)
Gate 1 forward transfer admittance y 21s
VDS = 8 V, VG2S = 4 V, VG1S = 0
IDSS = 10 mA (common-source)
Output admittance y 22s
VDS = 8 V, VG2S = 4 V, VG1S = 0
IDSS = 10 mA (common-source)
Semiconductor Group
7
BF 998
Test circuit 1 for power gain and noise figure
f = 200 MHz, GG = 2 mS, GL = 0.5 mS
Test circuit 2 for power gain and noise figure
f = 800 MHz, GG = 3.3 mS, GL = 1 mS
Semiconductor Group
8