AT24C512 (AT3552P/T) 2-Wire Bus Serial EEPROM Product Qualification • 2325 Orchard Parkway • San Jose CA 95131 • The AT24C512 2-Wire Bus Serial EEPROM is fabricated on the AT35000 CMOS process. With the exception of HBM ESD, all tests were performed at Atmel’s Colorado Springs Facility. This report summarizes the product level qualification data, ESD, Latchup, and Write Endurance for the AT24C512 Serial EEPROM. The AT3552P version is a single metal mask option repositioning the bond pads for the SOIC package. This version was evaluated for ESD and Latch Up and had the same level of performance as the AT3552T. This data, in conjunction with the AT35000 Process Qualification and Reliability Report, qualifies the AT24C512. Package specific qualification data is provided separately. • 2325 Orchard Parkway • San Jose CA 95131 • AT3552T Product Qualification ESD Characterization Device: AT24C512 (AT3552T) Lot Number: 2h1712 Quantity Tested: 3/ lot per Voltage ESD Stress Equipment:: ORYX Model 11000 ESD Test System; Human Body Mode Pass/Fail via Final Production Test Program: EPRO Model 142AX Tester Test per Mil Std 883, Method 3015: 3 Pulses Each Polarity per Specified Pin Combinations Pin Name Vcc Gnd A0 A1 A2 WP SCL SDA Function Tested As Power Ground Address Address Address Write Protect Serial Clock Input Serial Data Vcc Gnd Input Input Input Input Input Input/Output Functional Test Only Failing Pin Not Identified See Above 3 Positive & 3 Negative Pulses per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Qty/Fail Qty/Fail Qty/Fail Voltage 2000V 500V 1000V 4000V 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 3/0 3/0 3/0 3/3 3/0 3000 Machine Model Testing – JEDEC Std 22A, Method 115A Lot Number: 2h6886 1 Positive & 1 Negative Pulse per The Specified Pin Combinations Max Passing Voltage Qty/Fail Qty/Fail Pin Qty/Fail Qty/Fail Function Tested As Qty/Fail Voltage 50V 150V Name 100V 200V Vcc Power Vcc 3/0 3/0 3/1 3/0 3/0 200 Gnd Ground Gnd 3/0 3/0 3/1 3/0 3/0 200 A0 Address Input 3/0 3/0 3/1 3/0 3/0 200 A1 Address Input 3/0 3/0 3/1 3/0 3/0 200 A2 Address Input 3/0 3/0 3/1 3/0 3/0 200 WP Write Protect Input 3/0 3/0 3/1 3/0 3/0 200 SCL Serial Clock Input Input 3/0 3/0 3/1 3/0 3/0 200 SDA Serial Data Input/Output 3/0 3/0 3/1 3/0 3/0 200 Functional Test Only Failing Pin Not Identified See Above 3/0 3/0 3/1 • 2325 Orchard Parkway • San Jose CA 95131 • 3/0 3/0 200 AT3552T Product Qualification Latch-Up Characterization Device: AT24C512 (AT3552T) Lot Number: 2h1712 Quantity Tested: 5 per lot Test Method: JEDEC 78 Test Temperature: 125C Over Current Test Voltage Vcc = 5.0V Maximum Applied Trigger Current = 200 mA Maximum Applied Trigger Voltage = 7.0 V Pin Name Function Vcc Gnd A0 A1 A2 WP SCL SDA SDA Power Ground Address Address Address Write Protect Serial Clock Input Serial Data Serial Data Max Trigger Current Max Trigger Voltage Complianc Passing* Passing* Passing* Passing* Compliance e Setting Tested As -I (mA) +V (V) Setting (mA) +I (mA) -V (V) (V) Vcc --------7.0 250 Gnd ------------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Input 200 200 7.0 ------Output 200 200 7.0 ------- * 0 Fails for Latchup or Post Stress Functional Tests. Write Endurance Characterization Device: AT24C512 (3552T) Lot Number: 2h1712 Quantity Tested: 100 Test Temperature: 25C Vcc: 5 Volts Write Mode: Page Highest Passing Cycles: 500,000 Cycles To First Failure: 600,000 Quantity Failed: 1 • 2325 Orchard Parkway • San Jose CA 95131 •