VDE Prüf- und Zertifizierungsinstitut VDE Prüf- und Zertifizierungsinstitut GmbH • Merianstraße 28 • D-63069 Offenbach Cypress Semiconductor Corporation Mr. Sachin Gupta 198 Champion Ct. SAN JOSE CA 95134 USA Offenbach, 2012-10-10 Your ref. Your letter Our ref. - please indicate Contact Sachin Gupta 2012-05-09 5015887-4970-0001/171905 FG23/swa-gl1 Mr. Schwab Tel (+49) (69) 83 06-607 Fax (+49) (69) 83 06-606 [email protected] Translation: In any case the German version shall prevail PRÜFBERICHT zur Information des Auftraggebers Test Report for the Information of the applicant Produkt / Product: Component for washing machines and dishwashers Typ / Type: Microcontr. for Home Appl. Autom. Controls dieser Prüfbericht enthält das Ergebnis einer einmaligen Untersuchung an dem zur Prüfung vorgelegten Erzeugnis. Ein Muster dieses Erzeugnisses wurde geprüft, um die Übereinstimmung mit den nachfolgend aufgeführten Normen bzw. Abschnitten von Normen festzustellen. Die Prüfung wurde durchgeführt vom 2012-07-24 bis 2012-08-08. This test report contains the result of a singular investigation carried out on the product submitted. A sample of this product was tested to found the accordance with the thereafter listed standards or clauses of standards resp. The testing was carried out from 2012-07-24 to 2012-08-08. Der Prüfbericht berechtigt Sie nicht zur Benutzung eines Zertifizierungszeichens des VDE und berücksichtigt ausschließlich die Anforderungen der unten genannten Regelwerke. A COMPANY OF THE Q ASSOCIATION FOR ELECTRICAL, ELECTRONIC & INFORMATION TECHNOLOGIES Managing Director Dipl.-Ing./Dipl.-Kfm. Wilfried Jäger Merianstrasse 28 D-63069 Offenbach Phone: +49 (0) 69 83 06-0 Fax: +49 (0) 69 83 06-555 E-mail: [email protected] http://www.vde.com Venue: Offenbach/Main HRB 43618 VAT-IDNo.: DE261922990 Tax No.: 04425092566 Make Payments to Commerzbank AG BLZ 500 800 00 Account-No.: 198 027 000 S.W.I.F.T.-Code: DRES DE FF XXX IBAN DE 91500800000198027000 .../2 Notified Body according to the Product Safety Act (ProdSG) and the EMC Directive 2004/108/EC. Accredited according to DIN EN ISO/IEC 17020, 17021, 17025 and DIN EN 45011. Recognized Testing and Certification Body for International IEC certification schemes (IECEE and IECQ) and European certification schemes (CCA, HAR, ENEC). A Page 2 - 10.10.2012 Our reference 5015887-4970-0001/171905 FG23/swa-gl1 The test report does not entitle for the use of a VDE Certification Mark and considers solely the requirements of the specifications mentioned below. Wenn gegenüber Dritten auf diesen Prüfbericht Bezug genommen wird, muss dieser Prüfbericht in voller Länge an gleicher Stelle verfügbar gemacht werden. Whenever reference is made to this test report towards third party, this test report shall be made available on the very spot in full length. • I Beschreibung Description II Standards • • • • Software Selbstdiagnose-Bibiliothek für die CY8C22X45 Mikrokontroller-Familie. SW selftest library for the CY8C22X45 microcontroller family. IEC 60335-1:2010 (5 Edition) (incl. Corrigendum 1:2002) + A1:2004 + A2:2006 (incl. Corrigendum 1:2006) Annex R Table 11.12.7 and/or EN 60335-1:2002 + A11:2004 + A1:2004 + A12:2006 + Cor.:2006 + A2:2006 + Cor.:2007-01 + Cor.:2007-02 + A13:2008 + Cor.:2009 +Cor.:2010 + A14:2010 + A15:2011 Annex R EN 60730-1: 2009 Annex H Table 11.12.7 IEC 60730 Ed. 4.0: 2010-03 Annex H Table 11.12.7 Cypress Semiconductor 198 Champion Court, San Jose, CA 95134-1709 • • CY8C22X45 Class B library V1.0 CY8C28XXX Class B library V1.0 • • • • • • • • Measure Register test (read/write compare) ROM Checksum test (16Bit Checksum) Program counter - island jump test RAM test (March C- / March C / March B) Clock test (comparison / 2 clocks) WD self test (source of last reset) AD/DA Converter (partial coverage)* Input / output periphery (partial coverage)* • • • III Hersteller Manufacturer IV Identifikation Identification V Selbstdiagnose Funtionen Selftest functions Startup Library A COMPANY OF THE Q ASSOCIATION FOR ELECTRICAL, ELECTRONIC & INFORMATION TECHNOLOGIES Managing Director Dipl.-Ing./Dipl.-Kfm. Wilfried Jäger Merianstrasse 28 D-63069 Offenbach Phone: +49 (0) 69 83 06-0 Fax: +49 (0) 69 83 06-555 E-mail: [email protected] http://www.vde.com Venue: Offenbach/Main HRB 43618 VAT-IDNo.: DE261922990 Tax No.: 04425092566 Make Payments to Commerzbank AG BLZ 500 800 00 Account-No.: 198 027 000 S.W.I.F.T.-Code: DRES DE FF XXX IBAN DE 91500800000198027000 Reference H 2.16.5 H 2.19.3.1 H 2.16.5 H 2.19.6 H 2.18.10.1 N/A H 2.18.13 H 2.18.13 .../3 Notified Body according to the Product Safety Act (ProdSG) and the EMC Directive 2004/108/EC. Accredited according to DIN EN ISO/IEC 17020, 17021, 17025 and DIN EN 45011. Recognized Testing and Certification Body for International IEC certification schemes (IECEE and IECQ) and European certification schemes (CCA, HAR, ENEC). A Page 3 - 10.10.2012 VI Selbstdiagnose Funtionen Selftest functions Runtime Library Our reference 5015887-4970-0001/171905 FG23/swa-gl1 • • • • • • • • • • H 2.16.5 Register test (read/write compare) N/A Stack test (special pattern) H 2.18.10.1 Clock test (comparison / 2 clocks) H 2.19.3.1 ROM Checksum test (16Bit Checksum /blockwise) H 2.16.5 Programme counter (island / jump test) H 2.19.6 Sliced RAM test (C- / C) H 2.18.13 Input / output periphery (partial coverage)* H 2.18.13 AD/DA Converter (partial coverage)* H 2.19.5 Redundant inverse storage(example code)** VII Die Module sind zur Einbindung in eine übergeordnetes Benutzung Selbstdiagnoseprogramm vorgesehen, welches vom Hersteller der Usage Steuerung zur Prüfung vorzulegen ist. • The modules are intended to be included in a supervisory self diagnostic program which has to be presented for approval by the manufacturer of the electronic control. VIII • Die geprüften Module erfüllen die Anforderungen gemäß der unter II Ergebnis genannten Prüfbestimmungen. Result • Die Einbindung der Module ist in der jeweiligen Applikation zu prüfen. • The tested modules fulfil the requirements according the test specifications referred in chapter II. • The implementation of the modules has to be tested in each application. VIIII • Die Fehlerabdeckung entspricht den Anforderungen nach Tabelle Fehlerabdeckung • H 11.12.7 / Tabelle R1 (60335-1) / Tabelle H1 (60730-1) Diagnostic coverage • The diagnostic coverage fulfils the requirements of • Table H 11.12.7 / Table R1 / Table H1 (60730-1) *=only partial coverage of EN/IEC 60335-1 / EN/IEC 60730-1 requirements. **=additional coverage, not directly mentioned in EN/IEC 60335-1 / EN/IEC 60730-1. A COMPANY OF THE Q ASSOCIATION FOR ELECTRICAL, ELECTRONIC & INFORMATION TECHNOLOGIES Managing Director Dipl.-Ing./Dipl.-Kfm. Wilfried Jäger Merianstrasse 28 D-63069 Offenbach Phone: +49 (0) 69 83 06-0 Fax: +49 (0) 69 83 06-555 E-mail: [email protected] http://www.vde.com Venue: Offenbach/Main HRB 43618 VAT-IDNo.: DE261922990 Tax No.: 04425092566 Make Payments to Commerzbank AG BLZ 500 800 00 Account-No.: 198 027 000 S.W.I.F.T.-Code: DRES DE FF XXX IBAN DE 91500800000198027000 .../4 Notified Body according to the Product Safety Act (ProdSG) and the EMC Directive 2004/108/EC. Accredited according to DIN EN ISO/IEC 17020, 17021, 17025 and DIN EN 45011. Recognized Testing and Certification Body for International IEC certification schemes (IECEE and IECQ) and European certification schemes (CCA, HAR, ENEC). A Page 4 - 10.10.2012 Our reference 5015887-4970-0001/171905 FG23/swa-gl1 File Listing File Selftest.asm CRC.asm Selftest_csd.asm Selftest_sar_adc.asm Selftest_pc.asm Selftest_clock.asm Selftest_ram_march_b.asm Selftest_ram_march_c.asm Selftest_comparator.c SelfTest_StackOverflow.asm Selftest_ram_march_c_periodic.c Type Asm Asm Asm Asm Asm Asm Asm Asm C Asm C Version 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 Selftest_ram_march_low_lvl.asm ASM 1.0 SelfTest_WDT.c Selftest_ram_rom.c Selftest_uart.c Selftest_spi.c Selftest_clock_hw.c Selftest.inc CRC.inc Selftest_sar_adc.inc Selftest_pc.inc Selftest_clock.inc Selftest_ram_march_c.inc SelfTest_StackOverflow.inc Selftest_ram_march_c_periodic.h C C C C C Inc Inc Inc Inc Inc Inc Inc H 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 Selftest_ram_march_low_lvl.inc Inc 1.0 Selftest.h CRC.h Selftest_csd.h Selftest_sar_adc.h Selftest_pc.h Selftest_clock.h Selftest_ram_march_b.h Selftest_ram_march_c.h Selftest_comparator.h SelfTest_StackOverflow.h SelfTest_WDT.h Selftest_ram_rom.h Selftest_uart.h Selftest_spi.h Selftest_clock_hw.h H H H H H H H H H H H H H H H 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 1.0 A COMPANY OF THE MD5 CheckSum A1BE971904123BA017F461ED0FC7A9E3 *selfTest.asm A20E831B19E57AB3845F381616ABAEBB *CRC.asm 63000D1A27FA4CE44700E679EDC63641 *selftest_csd.asm 12FA8C15286F947AAC296BE92495E65B *selftest_sar_adc.asm CCCA035C2FB5C26BD4C2A057417A25ED *selftest_pc.asm BF099B105001FD2D0E66C2F1C0D3D8D3 *selftest_clock.asm 83A0A3FC3B5D66322A3374D8042B85DF *selftest_ram_march_b.asm 6AD0CBE30D08EF01F8FB298C63EC238B *selftest_ram_march_c.asm 5C4AC0C70FA709272E337D1558A104B0 *selftest_comparator.c C4BE7C0727BA3C56D7339C25EFD8C326 *selftest_stackoverflow.asm 89D290812854F5FBF63F107640583160 *selftest_ram_march_c_periodic.c F065B8E6F8B7BD001A11F104E5911D94 *selftest_ram_march_low_lvl.asm 9F7D68C07EEB6585B1E792F37E578F7F *selftest_wdt.c 0984B6F75C6A70ECD2C0FD9083CD6D6F *selftest_ram_rom.c 62D514C5B7FCED3F446149E9411BAFE2 *selftest_uart.c 65109B8CC956AC8117FB492CAEA93655 *selftest_spi.c DECAA74971B9740BB5D897DD68A46B06 *selftest_clock_hw.c 3A3A7DE700C3EE2A5ABCAB58667FB9F5 *selftest.inc 1212C6BF663B439B10DCF7B51BCCE047 *crc.inc 49CD6D4287EDC8093E8E60CE8FA79050 *selftest_sar_adc.inc A6968A50D134832CF35DA1314A25864E *selftest_pc.inc B491A93955BF83366C868A26271ED9DC *selftest_clock.inc A8241FD0EDA71675AFCD715EFA56F67C *selftest_ram_march_c.inc E5F90543419708EB355386D8C40EFFC3 *selftest_stackoverflow.inc 8A37749FC531A125163D376905D3314F *selftest_ram_march_c_periodic.h 8019138724080E4EDC09976CA323E8D6 *selftest_ram_march_low_lvl.h 85459B746971BA57E2EC9ACDC7232329 *selfTest.h 13DE43B815075B63CC65B2D35A41D788 *crc.h 4E50F5EBAFD49681330DBF4C757E8AAB *selftest_csd.h D4203411B8A289A1736C837BFB445FB0 *selftest_sar_adc.h 25B9A7323ADCB8AA60F8E3A887D22BE8 *selftest_pc.h E3F9AAA52CD2CBE5E212BD469744F2BF *selftest_clock.h DC527F525E202D00AA43C4E1CA1BA280 *selftest_ram_march_b.h 5D348D832026ACBB3EFFC73EAF85F06D *selftest_ram_march_c.h D5A0830CF3DF4A5AA4670A558859D0C0 *selftest_comparator.h 1B106593B1AD4207EFB9A1B42B89A438 *selftest_stackoverflow.h 2B1AF22C4C6E3197B6423B79AD6244DD *selftest_wdt.h 5A0BC4D87443F5A3B6C2C11CA7276B2C *selftest_ram_rom.h 23404E9ECC7B34EDD776407829E16505 *selftest_uart.h 5F823FA1B0DFF6043DF525748695CD2A *selftest_spi.h 19A1AB79A5E4453323F78084B6403745 *selftest_clock_hw.h Q ASSOCIATION FOR ELECTRICAL, ELECTRONIC & INFORMATION TECHNOLOGIES Managing Director Dipl.-Ing./Dipl.-Kfm. Wilfried Jäger Merianstrasse 28 D-63069 Offenbach Phone: +49 (0) 69 83 06-0 Fax: +49 (0) 69 83 06-555 E-mail: [email protected] http://www.vde.com Venue: Offenbach/Main HRB 43618 VAT-IDNo.: DE261922990 Tax No.: 04425092566 Make Payments to Commerzbank AG BLZ 500 800 00 Account-No.: 198 027 000 S.W.I.F.T.-Code: DRES DE FF XXX IBAN DE 91500800000198027000 .../5 Notified Body according to the Product Safety Act (ProdSG) and the EMC Directive 2004/108/EC. Accredited according to DIN EN ISO/IEC 17020, 17021, 17025 and DIN EN 45011. Recognized Testing and Certification Body for International IEC certification schemes (IECEE and IECQ) and European certification schemes (CCA, HAR, ENEC). A