Tested January 26, 2005 File: REF02S HDR generic.xls RADIATION TEST REPORT PRODUCT: REF02AZQMLR MASK: FILE: DATE CODE: GAMMA: GAMMA SOURCE: 0,100K Co60 DOSE RATE: 38.93 rad/sec FACILITIES: National Semiconductor Santa Clara, Ca. TESTED: 26-Jan-05 The RADTESTSM DATA SERVICE is a compilation of radiation test results on Analog Devices’ Space grade products. It is designed to assist customers in selecting the right product for applications where radiation is a consideration. Many products manufactured by Analog Devices, Inc. have been shown to be radiation tolerant to most tactical radiation environments, Analog Devices , Inc. does not make any claim to maintain or guarantee these levels of radiation tolerance without lot qualification test. It is the responsibility of the Procuring Activity to screen products from Analog Devices, Inc. for compliance to Nuclear Hardness Critical Items (HCI) specifications. WARNING: Analog Devices, Inc. does not recommend use of this data to qualify other product grades or process levels. Analog Devices, Inc. is not responsible and has no liability for any consequences, and all applicable Warranties are null and void, if any Analog product is modified in any way or used outside of normal environmental and operating conditions, including the parameters specified in the corresponding data sheet. Analog Devices does not guarantee that wafer manufacturing is the same for all process levels. Pages 1 of 3. Tested January 26, 2005 Pages 2 of 3. File: REF02S HDR generic.xls T#1.0 SN 1 ISY ,Vin=15V mA 100K 1.192 T# 2.0 SN 1 VOUT @Vin=15V 0K 4.996 V 100K 4.996 T# 3.0 SN 1 LN.REG 8V TO 33V 0K 1.190 0K 0.001 %/V 100K 0.001 2 3 4 5 26 27 28 29 51 52 53 54 76 77 78 79 101 102 103 104 min max stdev average +3S -3S 1.199 1.181 1.205 1.185 1.208 1.212 1.196 1.194 1.208 1.209 1.212 1.211 1.199 1.190 1.183 1.198 1.207 1.213 1.213 1.213 1.181 1.213 0.011 1.202 1.234 1.170 1.194 1.175 1.188 1.178 1.195 1.199 1.186 1.188 1.200 1.199 1.199 1.205 1.195 1.185 1.181 1.189 1.208 1.208 1.209 1.211 1.175 1.211 0.011 1.195 1.227 1.162 2 3 4 5 26 27 28 29 51 52 53 54 76 77 78 79 101 102 103 104 min max stdev average +3S -3S 5.002 4.990 5.001 4.996 5.002 4.996 4.997 4.995 4.996 4.990 4.996 5.002 4.996 4.996 4.992 4.996 5.002 5.002 4.996 5.002 4.990 5.002 0.004 4.997 5.009 4.985 5.008 4.996 5.008 5.007 5.014 5.008 5.008 5.002 5.002 5.002 5.002 5.010 5.008 5.008 5.002 5.008 5.010 5.012 5.008 5.014 4.996 5.014 0.005 5.007 5.021 4.993 2 3 4 5 26 27 28 29 51 52 53 54 76 77 78 79 101 102 103 104 min max stdev average +3S -3S 0.002 0.001 0.001 0.001 0.002 0.002 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.001 0.002 0.000 0.001 0.002 0.001 0.017 0.018 0.016 0.018 0.015 0.016 0.016 0.016 0.016 0.015 0.017 0.016 0.016 0.016 0.017 0.016 0.018 0.017 0.018 0.018 0.015 0.018 0.001 0.017 0.019 0.014 1.240 5.030 0.025 5.020 1.220 0.020 5.010 1.200 0.015 5.000 1.180 4.990 0.010 1.160 4.980 0.005 1.140 4.970 1.120 4.960 0K 100K 0.000 0K 100K 0K 100K Tested January 26, 2005 File: REF02S HDR generic.xls T# 4.0 SN 1 LD. REG 0 TO 10mA 0K 0.003 %/mA 100K 0.003 2 3 4 5 26 27 28 29 51 52 53 54 76 77 78 79 101 102 103 104 min max stdev average +3S -3S 0.003 0.004 0.003 0.004 0.003 0.003 0.003 0.004 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.003 0.004 0.000 0.003 0.004 0.003 0.004 0.004 0.003 0.004 0.004 0.003 0.003 0.004 0.003 0.004 0.003 0.004 0.003 0.004 0.004 0.003 0.003 0.004 0.004 0.004 0.003 0.004 0.000 0.004 0.004 0.003 0.005 0.004 0.004 0.003 0.003 0.002 0.002 0.001 0.001 0.000 0K 100K Pages 3 of 3.