Final Product/Process Change Notification Document # : FPCN20487XB Issue Date: 10 February 2016 Title of Change: SOT-553 package qualification of Assembly & Test in ON Semiconductor Leshan, China Proposed first ship date: 17 May 2016 Contact information: Contact your local ON Semiconductor Sales Office or <[email protected]> Samples: Contact your local ON Semiconductor Sales Office or <[email protected]>. Additional Reliability Data: Contact your local ON Semiconductor Sales Office or <[email protected]>. Type of notification: This is a Final Product/Process Change Notification (FPCN) sent to customers. FPCNs are issued 90 days prior to implementation of the change. ON Semiconductor will consider this change accepted, unless an inquiry is made in writing within 30 days of delivery of this notice. To do so, contact <[email protected]>. Change Part Identification: Affected products from ON semiconductor with date code 1619 representing WW19, 2016 and greater may be sourced from either the Seremban factory or the Leshan factory. Change category: ☐ Wafer Fab Change ☒ Assembly Change ☒ Test Change ☐ Other _______________ Change Sub-Category(s): ☒ Manufacturing Site Change/Addition ☐ Manufacturing Process Change ☐ Material Change ☐ Product specific change ☐ Datasheet/Product Doc change ☐ Shipping/Packaging/Marking ☐ Other: _______________________ Sites Affected: ☐ All site(s) ☒ ON Semiconductor site(s) : ☐ External Foundry/Subcon site(s) ☐ not applicable On Semiconductor Leshan Facility Description and Purpose: ON Semiconductor is notifying customers of the qualification and transfer of the assembly and test of SOT553 and SOT563 packages from ON Semiconductor Seremban facility to ON Semiconductor Leshan facility. The ON Semiconductor Leshan facility is certified with ISO/TS 16949:2009. The bill of materials used in the SOT553 packages will remain the same between both ON Semiconductor’s Seremban and Leshan’s facilities. Reliability qualification and full electrical characterization over temperature has been performed to ensure device functionality and electrical specifications are met. TEM001092 Rev. F Page 1 of 4 Final Product/Process Change Notification Document # : FPCN20487XB Issue Date: 10 February 2016 Reliability Data Summary: PACKAGE : SOT563 QV DEVICE NAME: NST3906DXV6T1G Cu wire Test HTRB HAST+PC RSH SD DPA Specification JESD22-A108 JESD22-A110 JESD22- B106 JSTD002 Condition Ta=150C,80% Rated Voltage Ta=130 C RH=85%, ~18.8 psig, bias Ta=260C, 10 sec, elec test Ta=245C, 10 sec per AEC Q101 post HAST 96 hrs Interval 1008 hrs 96 hrs Results 0/156 0/156 0/60 0/30 0/6 Interval 1008 hrs 96 hrs Results 0/78 0/78 0/30 0/4 QV DEVICE NAME: NST3906DXV6T1G Cu wire Test HTRB HAST+PC RSH DPA Specification JESD22-A108 JESD22-A110 JESD22- B106 Condition Ta=150C,80% Rated Voltage Ta=130 C RH=85%, ~18.8 psig, bias Ta=260C, 10 sec, elec test per AEC Q101 post HAST 96 hrs QV DEVICE NAME: NSV12100XV6T1G Cu wire Test HAST+PC HTRB RSH DPA Specification JESD22-A110 JESD22-A108 JESD22- B106 Condition Ta=130 C RH=85%, ~18.8 psig, bias Ta=150C,80% Rated Voltage Ta=260C, 10 sec, elec test per AEC Q101 post HAST 96 hrs Interval 96 hrs 1008 hrs Results 0/93 0/78 0/30 0/4 Specification J-STD-020 JESD-A113 JESD22-A108 JESD22-A108 JESD22-A110 JESD22-A103 MIL-STD-750 (M1037) AEC-Q101 JESD22-A104 JESD22- B106 JSTD002 Condition Ta=121C, RH=100%, ~15psig Ta=150C,80% Rated Voltage Ta=150C,80% Rated Voltage Ta=130 C RH=85%, ~18.8 psig, bias Ta=150C Interval 96 hrs 1008 hrs 1008 hrs 96 hrs 1512 hrs Results 0/84 0/84 0/84 0/89 0/89 Ta=25C, delta TJ = 100C Ton=Toff = 2min 15000 cyc 0/84 2000 cyc 0/84 0/30 0/15 0/2 0/2 QV DEVICE NAME: NTZD3155CT1H Cu wire Test Autoclave+PC HTRB HTGB HAST+PC HTSL IOL TC RSH SD DPA DPA TEM001092 Rev. F Ta= -65/150C Ta=260C, 10 sec, elec test Ta=245C, 10 sec per AEC Q101 post TC 1k cyc per AEC Q101 post HAST 96hrs Page 2 of 4 Final Product/Process Change Notification Document # : FPCN20487XB Issue Date: 10 February 2016 QV DEVICE NAME: NUF2230XV6T1G Cu wire Test Autoclave+PC HTRB HTSL IOL TC RSH SD DPA DPA Specification J-STD-020 JESD-A113 JESD22-A108 JESD22-A103 MIL-STD-750 (M1037) AEC-Q101 JESD22-A104 JESD22- B106 JSTD002 Condition Ta=121C, RH=100%, ~15psig Ta=150C,80% Rated Voltage Ta=150C Interval 96 hrs 1008 hrs 1512 hrs Results 0/84 0/84 0/89 Ta=25C, delta TJ = 100C Ton=Toff = 2min 15000 cyc 0/84 Ta= -55/150C Ta=260C, 10 sec, elec test Ta=245C, 10 sec per AEC Q101 post TC 1k cyc per AEC Q101 post HAST 96hrs 2000 cyc 0/84 0/30 0/15 0/2 0/2 Specification J-STD-020 JESD-A113 JESD22-A110 JESD22-A108 JESD22-A103 JESD22-A104 JESD22- B106 JSTD002 Condition Ta=121C, RH=100%, ~15psig Ta=130 C RH=85%, ~18.8 psig, bias Ta=150C,80% Rated Voltage Ta=150C Ta= -65/150C Ta=260C, 10 sec, elec test Ta=245C, 10 sec per AEC Q101 post TC 1k cyc per AEC Q101 post HAST 96hrs Interval 96 hrs 96 hrs 1008 hrs 1512 hrs 2000 cyc Results 0/84 0/89 0/84 0/89 0/84 0/30 0/15 0/2 0/2 Specification JESD22-A108 JESD22-A108 J-STD-020 JESD-A113 JESD22-A110 JESD22-A103 MIL-STD-750 (M1037) AEC-Q101 JESD22-A104 JESD22- B106 JSTD002 Condition Ta=150C,80% Rated Voltage Ta=150C,80% Rated Voltage Ta=121C, RH=100%, ~15psig Ta=130 C RH=85%, ~18.8 psig, bias Ta=150C Interval 1008 hrs 1008 hrs 96 hrs 96 hrs 1512 hrs Results 0/84 0/84 0/84 0/89 0/89 Ta=25C, delta TJ = 100C Ton=Toff = 2min 15000 cyc 0/84 2000 cyc 0/84 0/30 0/15 0/2 0/2 QV DEVICE NAME: NUP5120X6T1G Cu wire Test Autoclave+PC HAST+PC HTRB HTSL TC RSH SD DPA DPA QV DEVICE NAME: NTZS3151PT1G Cu wire Test HTRB HTGB Autoclave+PC HAST+PC HTSL IOL TC RSH SD DPA DPA TEM001092 Rev. F Ta= -65/150C Ta=260C, 10 sec, elec test Ta=245C, 10 sec per AEC Q101 post TC 1k cyc per AEC Q101 post HAST 96hrs Page 3 of 4 Final Product/Process Change Notification Document # : FPCN20487XB Issue Date: 10 February 2016 PACKAGE : SOT553 QV DEVICE NAME: NL17SZ126XV5T2G Test HTOL HTSL TC HAST+PC uHAST+PC RSH SD DPA DPA Specification JESD22-A108 JESD22-A103 JESD22-A104 JESD22-A110 JESD22-A118 JESD22- B106 JSTD002 Condition Tj=150C, Vcc=5.5V Ta=150C Ta= -65/150C Ta130C RH=85%, ~18.8 psig, bias Ta130C RH=85%, ~18.8 psig, unbias Ta=260C, 10 sec, elec test Ta = 245C, 10 sec per AEC Q101 post TC 500 cyc per AEC Q101 post HAST 96hrs Interval 1008 hrs 1008 hrs 1000 cyc 96 hrs 96 hrs Electrical Characteristic Summary: Electrical characteristics are not impacted. List of Affected Standard Parts: Part Number TEM001092 Rev. F Qualification Vehicle NL17SZ14XV5T2G NL17SZ126XV5T2G NL17SZ17XV5T2G NL17SZ126XV5T2G NL17SZU04XV5T2G NL17SZ126XV5T2G Page 4 of 4 Results 0/84 0/84 0/84 0/84 0/84 0/30 0/15 0/2 0/5