Freescale Semiconductor Advance Information Document Number: MC33982 Rev. 18.0, 9/2014 Single Intelligent High-current Selfprotected High-side Switch (2.0 mOhm) 33982 The 33982 is a self-protected silicon 2.0 mOhm high-side switch used to replace electromechanical relays, fuses, and discrete devices in power management applications. The 33982 is designed for harsh environments and includes selfrecovery features. The device is suitable for loads with high inrush current, as well as motors and all types of resistive and inductive loads. Programming, control, and diagnostics are implemented via the serial peripheral interface (SPI). A dedicated parallel input is available for alternate and pulsewidth modulation (PWM) control of the output. SPI-programmable fault trip thresholds allow the device to be adjusted for optimal performance in the application. HIGH-SIDE SWITCH Features Single 2.0 m max high-side switch with parallel input or SPI control 6.0 V to 27 V operating voltage with standby currents < 5.0 A Output current monitoring with two SPI-selectable current ratios SPI control of overcurrent limit, overcurrent fault blanking time, output OFF open load detection, output ON/OFF control, watchdog timeout, slew rates, and fault status reporting • SPI status reporting of overcurrent, open and shorted loads, overtemperature shutdown, undervoltage and overvoltage shutdown, Fail-safe pin status, and program status • Enhanced -16 V reverse polarity VPWR protection Bottom View • • • • VDD VDD VDD FK SUFFIX SCALE 1:1 98ARL10521D 16-PIN PQFN Applications • DC motor or solenoid • Resistive and inductive loads • Low-voltage lighting VPWR 33982 VDD I/O FS I/O WAKE SO SI SCLK MCU VPWR GND SCLK CS CS SI SO I/O RST I/O IN HS LOAD A/D CSNS FSI GND GND PWR GND Figure 1. 33982 Simplified Application Diagram * This document contains certain information on a new product. Specifications and information herein are subject to change without notice. © Freescale Semiconductor, Inc., 2007-2014. All rights reserved. ORDERABLE PARTS ORDERABLE PARTS Table 1. Orderable Part Variations (1) Part Number Temperature (TA) Package Output Clamp Energy Reference Location OD3 bit for X111 address Reference Location MC33982CHFK -40 °C to 125 °C 16 PQFN 1.0J Table 3 1 Table 16 Notes 1. To order parts in Tape & Reel, add the R2 suffix to the part number. 33982 2 Analog Integrated Circuit Device Data Freescale Semiconductor INTERNAL BLOCK DIAGRAM INTERNAL BLOCK DIAGRAM VDD VPWR Internal Regulator IUP CS Overvoltage Protection Programmable Switch Delay 0 ms to525 ms SO SPI 3.0 MHz SI SCLK FS IN RST WAKE VIC Selectable Slew Rate Gate Drive HS Selectable Overcurrent High Detection 150 A or 100 A Logic Selectable Overcurrent Low Detection Blanking Time 0.15 ms to 155 ms IDWN Selectable Overcurrent Low Detection 15 A to 50 A Open Load Detection RDWN Overtemperature Detection Programmable Watchdog 310 ms to 2500 ms VIC Selectable Output Current Recopy 1/5400 or 1/40000 IUP FSI GND CSNS Figure 2. 33982 Simplified Internal Block Diagram 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 3 PIN CONNECTIONS PIN CONNECTIONS 4 3 2 CSNS RST WAKE 6 5 IN FS CS 8 7 FSI SI SCLK SO VDD NC 12 11 10 9 1 13 GND TRANSPARENT TOP VIEW 14 VPWR 15 HS 16 HS Figure 3. 33982 Pin Connections Functional descriptions of many of these pins can be found in the Functional Pin Description section beginning on page 16. Table 2. Pin Definitions Pin Number Pin Name Pin Function Formal Name Definition 1 CSNS Output Output Current Monitoring This pin is used to output a current proportional to the high-side output current and used externally to generate a ground-referenced voltage for the microcontroller to monitor output current. 2 WAKE Input Wake This pin is used to input a logic [1] signal in order to enable the watchdog timer function. 3 RST Input Reset (Active Low) This input pin is used to initialize the device configuration and fault registers, as well as place the device in a low current sleep mode. 4 IN Input Direct Input The Input pin is used to directly control the output. 5 FS Output Fault Status (Active Low) This is an open drain configured output requiring an external pull-up resistor to VDD for fault reporting. 6 FSI Input Fail-Safe Input The value of the resistance connected between this pin and ground determines the state of the output after a watchdog timeout occurs. 7 CS Input Chip Select (Active Low) This input pin is connected to a chip select output of a master microcontroller (MCU). 8 SCLK Input Serial Clock This input pin is connected to the MCU providing the required bit shift clock for SPI communication. 9 SI Input Serial Input This is a command data input pin connected to the SPI Serial Data Output of the MCU or to the SO pin of the previous device in a daisy chain of devices. 10 VDD Input Digital Drain Voltage (Power) 11 SO Output Serial Output This output pin is connected to the SPI Serial Data Input pin of the MCU or to the SI pin of the next device in a daisy chain of devices. 12 NC NC No Connect This pin may not be connected. This is an external voltage input pin used to supply power to the SPI circuit. 33982 4 Analog Integrated Circuit Device Data Freescale Semiconductor PIN CONNECTIONS Table 2. Pin Definitions (continued) Pin Number Pin Name Pin Function Formal Name 13 GND Ground Ground 14 VPWR Input Positive Power Supply 15, 16 HS Output High-side Output Definition This pin is the ground for the logic and analog circuitry of the device. This pin connects to the positive power supply and is the source input of operational power for the device. Protected high-side power output to the load. Output pins must be connected in parallel for operation. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 5 ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 3. Maximum Ratings All voltages are with respect to ground unless otherwise noted. Symbol Rating Value Unit Notes Operating Voltage Range Steady-state -16 to 41 V VDD VDD Supply Voltage -0.3 to 5.5 V VIN, RST, FSI, CSNS, SI, SCLK, CS, FS Input/Output Voltage - 0.3 to 7.0 V (2) - 0.3 to VDD + 0.3 V (2) ELECTRICAL RATINGS VPWR VSO SO Output Voltage ICL(WAKE) WAKE Input Clamp Current 2.5 mA ICL(CSNS) CSNS Input Clamp Current 10 mA IHS Output Current 60 A VHS Output Voltage Positive Negative 41 -15 V ECL Output Clamp Energy 33982B 33982C 1.5 1.0 J (4) V (5) VESD1 VESD3 ESD Voltage Human Body Model (HBM) Charge Device Model (CDM) Corner Pins (1, 12, 15, 16) All Other Pins (2, 11, 13, 14) ± 2000 (3) ±750 ±500 Notes 2. Exceeding this voltage limit may cause permanent damage to the device. 3. Continuous high-side output current rating so long as maximum junction temperature is not exceeded. Calculation of maximum output current using package thermal resistance is required. 4. Active clamp energy using single-pulse method (L = 16 mH, RL = 0, VPWR = 12 V, TJ = 150°C). 5. ESD1 testing is performed in accordance with the Human Body Model (HBM) (CZAP = 100 pF, RZAP = 1500 ESD3 testing is performed in accordance with the Charge Device Model (CDM), Robotic (Czap = 4.0 pF). 33982 6 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS MAXIMUM RATINGS Table 3. Maximum Ratings All voltages are with respect to ground unless otherwise noted. Symbol Rating Value Unit Notes Operating Temperature Ambient Junction - 40 to 125 - 40 to 150 C TSTG Storage Temperature - 55 to 150 C RJC RJA Thermal Resistance Junction-to-Case Junction-to-Ambient <1.0 30 C/W (6) TPPRT Peak Package Reflow Temperature During Reflow Note 8 °C (7), (8) THERMAL RATINGS TA TJ Notes 6. Device mounted on a 2s2p test board per JEDEC JESD51-2. 7. Pin soldering temperature limit is for 40 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause malfunction or permanent damage to the device. 8. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 7 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 4. Static Electrical Characteristics Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit 6.0 – 27 V Notes POWER INPUT VPWR Battery Supply Voltage Range Full Operational IPWR(ON) VPWR Operating Supply Current Output ON, IHS = 0 A – – 20 mA IPWR(SBY) VPWR Supply Current Output OFF, Open Load Detection Disabled, WAKE > 0.7 VDD, RST = VLOGIC HIGH – – 5.0 mA – – – – 10 50 A IPWR(SLEEP) Sleep State Supply Current (VPWR < 14 V, RST < 0.5 V, WAKE < 0.5 V) TJ = 25 C TJ = 85 C VDD(ON) VDD Supply Voltage 4.5 5.0 5.5 V IDD(ON) VDD Supply Current No SPI Communication 3.0 MHz SPI Communication – – – – 1.0 5.0 mA IDD(SLEEP) VDD Sleep State Current – – 5.0 A VPWR(OV) Overvoltage Shutdown Threshold 28 32 36 V VPWR(OVHYS) Overvoltage Shutdown Hysteresis 0.2 0.8 1.5 V Undervoltage Output Shutdown Threshold 5.0 5.5 6.0 V (9) (10) VPWR(UV) VPWR(UVHYS) Undervoltage Hysteresis – 0.25 – V VPWR(UVPOR) Undervoltage Power-ON Reset – – 5.0 V – – – – – – 3.0 2.0 2.0 – – – – – – 5.1 3.4 3.4 – 2.0 4.0 m 120 80 150 100 180 120 A POWER OUTPUT RDS(on) Output Drain-to-Source ON Resistance (IHS = 30 A, TJ = 25 C) VPWR = 6.0 V VPWR = 10 V VPWR = 13 V RDS(on) Output Drain-to-Source ON Resistance (IHS = 30 A, TJ = 150 C) VPWR = 6.0 V VPWR = 10 V VPWR = 13 V RDS(on) Output Source-to-Drain ON Resistance (IHS = 30 A, TJ = 25 C) VPWR = -12 V IOCH0 IOCH1 Output Overcurrent High Detection Levels (9.0 V < VPWR < 16 V) SOCH = 0 SOCH = 1 m m (11) Notes 9. This applies to all internal device logic that is supplied by VPWR and assumes that the external VDD supply is within specification. 10. This applies when the undervoltage fault is not latched (IN = 0). 11. Source-Drain ON Resistance (Reverse Drain-to-Source ON Resistance) with negative polarity VPWR. 33982 8 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 4. Static Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes POWER OUTPUT (CONTINUED) IOCL0 IOCL1 IOCL2 IOCL3 IOCL4 IOCL5 IOCL6 IOCL7 Overcurrent Low Detection Levels (SOCL[2:0]) 000 001 010 011 100 101 110 111 41 36 32 29 25 20 16 12 50 45 40 35 30 25 20 15 59 54 48 41 35 30 24 18 CSR0 CSR1 Current Sense Ratio (9.0 V < VPWR < 16 V, CSNS < 4.5 V) DICR D2 = 0 DICR D2 = 1 – – 1/5400 1/40000 – – - 20 -14 -13 -12 -13 -13 – – – – – – 20 14 13 12 13 13 - 25 -19 -18 -17 -18 -18 – – – – – – 25 19 18 17 18 18 Current Sense Clamp Voltage CSNS Open, IHS = 59.0 A 4.5 6.0 7.0 V Current Sense Leakage IN = 1 with OUT opened of load or IN = 0 0.0 10 20 A (12) Open Load Detection Current 30 – 100 A (13) Output Fault Detection Threshold Output Programmed OFF 2.0 3.0 4.0 V VCL Output Negative Clamp Voltage 0.5 A < IHS < 2.0 A, Output OFF - 20 – -15 V TSD Overtemperature Shutdown 160 175 190 C (14) Overtemperature Shutdown Hysteresis 5.0 – 20 C (14) Current Sense Ratio (CSR0) Accuracy Output Current 10 A CSR0_ACC 20 A 25 A 30 A 40 A 50 A Current Sense Ratio (CSR1) Accuracy Output Current 10 A CSR1_ACC 20 A 25 A 30 A 40 A 50 A VCL(CSNS) ILEAK(CSNS) IOLDC VOLD(THRES) TSD(HYS) A – % % Notes 12. This parameter is achieved by the design characterization by measuring a statistically relevant sample size across process variations but, not tested in production. 13. Output OFF open load detection current is the current required to flow through the load for the purpose of detecting the existence of an open load condition when the specific output is commanded OFF. 14. Guaranteed by process monitoring. Not production tested. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 9 ELECTRICAL CHARACTERISTICS STATIC ELECTRICAL CHARACTERISTICS Table 4. Static Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40 C TA 125 C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes CONTROL INTERFACE VIH Input Logic High-voltage 0.7 x VDD – – V (15) VIL Input Logic Low-voltage – – 0.2 x VDD V (15) Input Logic Voltage Hysteresis 100 600 1200 mV (16) IDWN Input Logic Pull-down Current (SCLK, IN, SI) 5.0 – 20 A VRST RST Input Voltage Range 4.5 5.0 5.5 V CSO SO, FS Tri-state Capacitance – – 20 pF 100 200 400 k – 4.0 12 pF (17) (18) VIN(HYS) RDWN CIN Input Logic Pull-down Resistor (RST) and WAKE Input Capacitance VCL(WAKE) WAKE Input Clamp Voltage ICL(WAKE) < 2.5 mA 7.0 – 14 V VF(WAKE) WAKE Input Forward Voltage ICL(WAKE) = -2.5 mA - 2.0 – -0.3 V VSOH SO High-state Output Voltage IOH = 1.0 mA 0.8 x VDD – – V VSOL FS, SO Low-state Output Voltage IOL = -1.6 mA – 0.2 0.4 V SO Tri-state Leakage Current CS > 0.7 x VDD -5.0 0.0 5.0 A Input Logic Pull-up Current CS, VIN > 0.7 x VDD 5.0 – 20 A – 6.0 30 0.0 10 – 1.0 14 – ISO(LEAK) IUP RFS RFSDIS RFSOFF RFSON FSI Input Pin External Pull-down Resistance FSI Disabled, HS Indeterminate FSI Enabled, HS OFF FSI Enabled, HS ON (17) (19) k Notes 15. Upper and lower logic threshold voltage range applies to SI, CS, SCLK, RST, IN, and WAKE input signals. The WAKE and RST signals may be supplied by a derived voltage reference to VPWR. 16. 17. 18. 19. No hysteresis on FSI and wake pins. Parameter is guaranteed by process monitoring but is not production tested. Input capacitance of SI, CS, SCLK, RST, and WAKE. This parameter is guaranteed by process monitoring but is not production tested. The current must be limited by a series resistance when using voltages > 7.0 V. Pull-up current is with CS OPEN. CS has an active internal pull-up to VDD. 33982 10 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Table 5. Dynamic Electrical Characteristics Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40C TA 125C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes POWER OUTPUT TIMING SRRA_SLOW Output Rising Slow Slew Rate A (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.15 0.5 1.0 V/s (20) SRRB_SLOW Output Rising Slow Slew Rate B (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.06 0.2 0.6 V/s (21) SRRA_FAST Output Rising Fast Slew Rate A (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.3 0.8 3.2 V/s (20) SRRB_FAST Output Rising Fast Slew Rate B (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.06 0.2 2.4 V/s (21) SRFA_SLOW Output Falling Slow Slew Rate A (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.15 0.5 1.0 V/s (20) SRFB_SLOW Output Falling Slow Slew Rate B (DICR D3 = 0) 9.0 V < VPWR < 16 V 0.06 0.2 0.6 V/s (21) SRFA_FAST Output Falling Fast Slew Rate A (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.6 1.6 3.2 V/s (20) SRFB_FAST Output Falling Fast Slew Rate B (DICR D3 = 1) 9.0 V < VPWR < 16 V 0.2 0.7 2.4 V/s (21) Output Turn-ON Delay Time in Fast/Slow Slew Rate DICR = 0, DICR = 1 1.0 18 100 s (22) tDLY_SLOW(OFF) Output Turn-OFF Delay Time in Slow Slew Rate Mode DICR = 0 10 115 250 s (23) tDLY_FAST(OFF) Output Turn-OFF Delay Time in Fast Slew Rate Mode DICR = 1 5.0 30 100 s (23) – 300 – Hz tDLY(ON) f PWM Direct Input Switching Frequency (DICR D3 = 0) t OCL0 t OCL1 t OCL2 t OCL3 Overcurrent Low Detection Blanking Time (OCLT [1:0]) 00 01 10 11 108 7.0 0.8 0.08 155 10 1.2 0.15 202 13 1.6 0.25 t OCH Overcurrent High Detection Blanking Time 1.0 10 20 ms s Notes 20. Rise and Fall Slew Rates A measured across a 5.0 resistive load at high-side output = 0.5 V to VPWR - 3.5 V. These parameters are guaranteed by process monitoring. 21. Rise and Fall Slow Slew Rates B measured across a 5.0 resistive load at high-side output = VPWR - 3.5 V to VPWR - 0.5 V. These parameters are guaranteed by process monitoring. 22. Turn-ON delay time measured from rising edge of any signal (IN, SCLK, CS) that would turn the output ON to VHS = 0.5 V with RL = 5.0 resistive load. 23. Turn-OFF delay time measured from falling edge of any signal (IN, SCLK, CS) that would turn the output OFF to VHS = VPWR - 0.5 V with RL = 5.0 resistive load. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 11 ELECTRICAL CHARACTERISTICS DYNAMIC ELECTRICAL CHARACTERISTICS Table 5. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40C TA 125C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes – – 10 s (24) Output Switching Delay Time (OSD [2:0]) 000 001 010 011 100 101 110 111 – 52 105 157 210 262 315 367 0.0 75 150 225 300 375 450 525 – 95 195 293 390 488 585 683 Watchdog Timeout (WD [1:0]) 00 01 10 11 434 207 1750 875 620 310 2500 1250 806 403 3250 1625 Recommended Frequency of SPI Operation – – 3.0 MHz Required Low-state Duration for RST – 50 167 ns POWER OUTPUT TIMING (CONTINUED) t CNSVAL t OSD0 t OSD1 t OSD2 t OSD3 t OSD4 t OSD5 t OSD6 t OSD7 t WDTO0 t WDTO1 t WDTO2 t WDTO3 CS to CSNS Valid Time ms ms (25) SPI INTERFACE CHARACTERISTICS f SPI t WRST (26) Notes 24. Time necessary for the CSNS to be within ±5% of the targeted value. 25. Watchdog timeout delay measured from the rising edge of WAKE to RST from a sleep state condition to output turn-ON with the output driven OFF and FSI floating. The values shown are for WDR setting of [00]. The accuracy of tWDTO is consistent for all configured watchdog timeouts. 26. RST low duration measured with outputs enabled and going to OFF or disabled condition. 33982 12 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS Table 5. Dynamic Electrical Characteristics (continued) Characteristics noted under conditions 4.5 V VDD 5.5 V, 6.0 V VPWR 27 V, -40C TA 125C, unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25C under nominal conditions, unless otherwise noted. Symbol Characteristic Min Typ Max Unit Notes Rising Edge of CS to Falling Edge of CS (Required Setup Time) – – 300 ns (27) t ENBL Rising Edge of RST to Falling Edge of CS (Required Setup Time) – – 5.0 s (27) t LEAD Falling Edge of CS to Rising Edge of SCLK (Required Setup Time) – 50 167 ns (27) t WSCLKH Required High-state Duration of SCLK (Required Setup Time) – – 167 ns (27) t WSCLKL Required Low-state Duration of SCLK (Required Setup Time) – – 167 ns (27) Falling Edge of SCLK to Rising Edge of CS (Required Setup Time) – 50 167 ns (27) t SI(SU) SI to Falling Edge of SCLK (Required Setup Time) – 25 83 ns (28) t SI(HOLD) Falling Edge of SCLK to SI (Required Setup Time) – 25 83 ns (28) t RSO SO Rise Time CL = 200 pF – 25 50 ns t FSO SO Fall Time CL = 200 pF – 25 50 ns t RSI SI, CS, SCLK, Incoming Signal Rise Time – – 50 ns (28) t FSI SI, CS, SCLK, Incoming Signal Fall Time – – 50 ns (28) t SO(EN) Time from Falling Edge of CS to SO Low-impedance – – 145 ns (29) t SO(DIS) Time from Rising Edge of CS to SO High-impedance – 65 145 ns (30) Time from Rising Edge of SCLK to SO Data Valid 0.2 VDD SO 0.8 VDD, CL = 200 pF – 65 105 ns (31) SPI INTERFACE CHARACTERISTICS t CS t LAG t VALID Notes 27. 28. 29. 30. 31. Maximum setup time required for the 33982 is the minimum guaranteed time needed from the microcontroller. Rise and Fall time of incoming SI, CS, and SCLK signals suggested for design consideration to prevent the occurrence of double pulsing. Time required for output status data to be available for use at SO. 1.0 kon pull-up on CS. Time required for output status data to be terminated at SO. 1.0 kon pull-up on CS. Time required to obtain valid data out from SO following the rise of SCLK. TIMING DIAGRAMS CS VPWR VPWR VPWR - 0.5V VPWR -0.5 V VPWR 3V V VPWR--3.5 SR FB_SLOW & SRFB_FAST SRfB SRRB_SLOW & SRRB_FAST SRrB SRfA SR FA_SLOW & SRFA_FAST SRRA_SLOW & SRRA _FAST SRrA HS 0.5V 0.5 V t DLY(ON) Tdly (on) t DLY_SLOW(OFF) & tDLY_FAST(OFF) Tdly(off) Figure 4. Output Slew Rate and Time Delays 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 13 ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS IOCHx Load Current IOCLx t OCH Time t OCLx Figure 5. Overcurrent Shutdown IOCH0 IOCH1 IOCL0 IOCL1 Load Current IOCL2 IOCL3 IOCL4 IOCL5 IOCL6 IOCL7 Time t OCHx t OCL3 t OCL2 t OCL1 t OCL0 Figure 6. Overcurrent Low and High Detection Figure 6 illustrates the overcurrent detection level (IOCLX, IOCHX) the device can reach for each overcurrent detection blanking time (tOCHX, tOCLX): • During tOCHX, the device can reach up to Ioch0 overcurrent level. • During tOCL3 or tOCL2 or tOCL1 or tOCL0, the device can be programmed to detect up to Iocl0. 33982 14 Analog Integrated Circuit Device Data Freescale Semiconductor ELECTRICAL CHARACTERISTICS TIMING DIAGRAMS VIH V IH RSTB RST 0.2 VDD 0.2 VDD VIL VIL TwRSTB t WRST t ENBL tTCSB CS TENBL VIH V 0.7 VDD 0.7VDD CS CSB IH 0.2 VDD 0.7VDD t WSCLKH TwSCLKh tTlead LEAD VIL V IL t RSI TrSI t LAG Tlag 0.70.7VDD VDD SCLK SCLK VIH VIH 0.2 VDD 0.2VDD VIL V tTSIsu SI(SU) IL t WSCLKl TwSCLKl t SI(HOLD) TSI(hold) VIH V 0.7 0.7 V VDD DD 0.2VDD 0.2 VDD Don’t Care SI SI tTfSI FSI Don’t Care Valid Valid Don’t Care IH VIH VIL Figure 7. Input Timing Switching Characteristics tFSI t RSI TrSI TfSI VOH VOH 3.5 V 3.5V 50% SCLK SCLK 1.0VV 1.0 VOL VOL t SO(EN) TdlyLH SO SO 0.7 V VDD DD 0.20.2 VDD VDD Low-to-High Low to High TrSO t RSO VOH VOH VOL VOL VALID tTVALID SO TfSO t FSO SO VOH VOH 0.7VDD VDD High to Low 0.7 High-to-Low 0.2VDD 0.2 VDD TdlyHL VOL VOL t SO(DIS) Figure 8. SCLK Waveform and Valid SO Data Delay Time 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 15 FUNCTIONAL DESCRIPTION INTRODUCTION FUNCTIONAL DESCRIPTION INTRODUCTION The 33982 is a self-protected silicon 2.0 m high-side switch used to replace electromechanical relays, fuses, and discrete devices in power management applications. The 33982 is designed for harsh environments, including self-recovery features. The device is suitable for loads with high inrush current, as well as motors and all types of resistive and inductive loads. Programming, control, and diagnostics are implemented via the Serial Peripheral Interface (SPI). A dedicated parallel input is available for alternate and pulse width modulation (PWM) control of the output. SPI programmable fault trip thresholds allow the device to be adjusted for optimal performance in the application. The 33982 is packaged in a power-enhanced 12 mm x 12 mm non-leaded PQFN package with exposed tabs. FUNCTIONAL PIN DESCRIPTION OUTPUT CURRENT MONITORING (CSNS) The CSNS pin outputs a current proportional to the high-side output current and used externally to generate a ground-referenced voltage for the microcontroller to monitor output current. WAKE (WAKE) This pin is used to input a logic [1] signal in order to enable the watchdog timer function. An internal clamp protects this pin from high damaging voltages when the output is current limited with an external resistor. This input has a passive internal pull-down. RESET (RST) This input pin is used to initialize the device configuration and fault registers, as well as place the device in a low-current sleep mode. The pin also starts the watchdog timer when transitioning from logic LOW to logic HIGH. This pin should not be allowed to be logic High until VDD is in regulation. This pin has a passive internal pull-down. DIRECT IN (IN) The Input pin is used to directly control the output. This input has an active internal pull-down current source and requires CMOS logic levels. This input may be configured via the SPI. FAULT STATUS (FS) This is an open drain configured output requiring an external pull-up resistor to VDD for fault reporting. When a device fault condition is detected, this pin is active LOW. Specific device diagnostic faults are reported via the SPI SO pin. FAIL-SAFE INPUT (FSI) The value of the resistance connected between this pin and ground determines the state of the output after a watchdog timeout occurs. Depending on the resistance value, either the output is OFF or ON. When the FSI pin is connected to GND, the watchdog circuit and Failsafe operation are disabled. This pin incorporates an active internal pull-up current source. CHIP SELECT (CS) This input pin is connected to a chip select output of a master microcontroller (MCU). The MCU determines which device is addressed (selected) to receive data by pulling the CS pin of the selected device logic Low, enabling SPI communication with the device. Other unselected devices on the serial link having their CS pins pulled up logic High disregard the SPI communication data sent. This pin incorporates an active internal pull-up current source. SERIAL CLOCK (SCLK) This input pin is connected to the MCU providing the required bit shift clock for SPI communication. It transitions one time per bit transferred at an operating frequency, fSPI, defined by the communication interface. The 50 percent duty cycle CMOS-level serial clock signal is idle between command transfers. The signal is used to shift data into and out of the device. This input has an active internal pull-down current source. SERIAL INTERFACE (SI) This is a command data input pin connected to the SPI Serial Data Output of the MCU or to the SO pin of the previous device in a daisy chain of devices. The input requires CMOS logic level signals and incorporates an active internal pull-down current source. Device control is facilitated by the input's receiving the MSB first of a serial 8-bit control command. The MCU ensures data is available upon the falling edge of SCLK. The logic state of SI present upon the rising edge of SCLK loads that bit command into the internal command shift register. 33982 16 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DESCRIPTION FUNCTIONAL PIN DESCRIPTION DIGITAL DRAIN VOLTAGE POWER (VDD) This is an external voltage input pin used to supply power to the SPI circuit. In the event VDD is lost, an internal supply provides power to a portion of the logic, ensuring limited functionality of the device. All device configuration registers are reset. SERIAL OUTPUT (SO) This output pin is connected to the SPI Serial Data Input pin of the MCU or to the SI pin of the next device in a daisy chain of devices. This output remains tri-stated (high-impedance OFF condition) so long as the CS pin of the device is logic High. SO is only active when the CS pin of the device is asserted logic Low. The generated SO output signals are CMOS logic levels. SO output data is available on the falling edge of SCLK and transitions immediately on the rising edge of SCLK. POSITIVE POWER SUPPLY (VPWR) This pin connects to the positive power supply and is the source input of operational power for the device. The VPWR pin is a backside surface mount tab of the package. HIGH-SIDE OUTPUT (HS) This pin protects high-side power output to the load. Output pins must be connected in parallel for operation. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 17 FUNCTIONAL DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION FUNCTIONAL INTERNAL BLOCK DESCRIPTION MC33982 - Functional Block Diagram Power Supply Self-protected High-side Switch MCU Interface and Output Control SPI Interface Power Supply HS Parallel Control Inputs MCU Interface and Output Control High-side Switch Figure 9. Functional Internal Block Diagram POWER SUPPLY The 33982 is designed to operate from 4.0 V to 28 V on the VPWR pin. Characteristics are provided from 6.0 V to 20 V for the device. The VPWR pin supplies power to internal regulator, analog, and logic circuit blocks. The VDD supply is used for serial peripheral interface (SPI) communication in order to configure and diagnose the device. This IC architecture provides a low quiescent current sleep mode. Applying VPWR and VDD to the device places the device in the Normal mode. The device transits to Fail-safe mode in case of failures on the SPI (watchdog timeout). HIGH-SIDE SWITCH: HS This pin is the high-side output controlling multiple automotive loads with high inrush current, as well as motors and all types of resistive and inductive loads. This N-channel MOSFET with a 2.0 mRDS(on), is self-protected and presents extended diagnostics to detect load disconnections and short-circuit fault conditions. The HS output is actively clamped during a turn-off of inductive loads. MCU INTERFACE AND OUTPUT CONTROL In Normal mode, the load is controlled directly from the MCU through the SPI. With a dedicated SPI command, it is possible to independently turn on and off several loads that are PWMed at the same frequency, and duty cycles with only one PWM signal. An analog feedback output provides a current proportional to the load current. The SPI is used to configure and to read the diagnostic status (faults) of high-side output. The reported fault conditions are: open load, short-circuit to ground (OCLO-resistive and OCHI-severe short-circuit), thermal shutdown, and under/overvoltage. In Fail-safe mode, the load is controlled with dedicated parallel input pins. The device is configured in default mode. 33982 18 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES FUNCTIONAL DEVICE OPERATION OPERATIONAL MODES The 33982 has four operating modes: Sleep, Normal, Fault, and Fail-safe. Table 6 summarizes details contained in succeeding paragraphs. Table 6. Fail-safe Operation and Transitions to Other 33982 Modes Mode FS WAKE RST WDTO Sleep x 0 0 x Device is in Sleep mode. All outputs are OFF. Normal 1 x 1 No Normal mode. Watchdog is active if enabled. 0 1 x x 1 No The device is currently in Fault mode. The faulted output is OFF. 0 1 0 1 1 1 1 1 0 1 Yes Watchdog has timed out and the device is in Fail-safe mode. The output is as configured with the RFS resistor connected to FSI. RST and WAKE must be transitioned to logic [0] simultaneously to bring the device out of the Fail-safe mode or momentarily tied the FSI pin to ground. 1 1 0 Fault Fail-safe Comments x = Don’t care. SLEEP MODE The default mode of the 33982 is the Sleep mode. This is the state of the device after first applying battery voltage (VPWR), prior to any I/O transitions. This is also the state of the device when the WAKE and RST are both logic [0]. In the Sleep mode, the output and all unused internal circuitry, such as the internal 5.0 V regulator, are off to minimize current draw. In addition, all SPI-configurable features of the device are as if set to logic [0]. The device transitions to the Normal or Fail-safe operating modes based on the WAKE and RST inputs as defined in Table 6. NORMAL MODE The 33982 is in Normal mode when: • VPWR is within the normal voltage range. • RST pin is logic [1]. • No fault has occurred. FAIL-SAFE MODE AND WATCHDOG If the FSI input is not grounded, the watchdog timeout detection is active when either the WAKE or RST input pin transitions from logic [0] to logic [1]. The WAKE input is capable of being pulled up to VPWR with a series of limiting resistance that limits the internal clamp current. The watchdog timeout is a multiple of an internal oscillator and is specified in Table 15. As long as the WD bit (D7) of an incoming SPI message is toggled within the minimum watchdog timeout period (WDTO), based on the programmed value of the WDR the device operates normally. If an internal watchdog timeout occurs before the WD bit, the device reverts to a Fail-safe mode until the device is reinitialized. During the Fail-safe mode, the output is ON or OFF depending upon the resistor RFS connected to the FSI pin, regardless of the state of the various direct inputs and modes (Table 7). In this mode, the SPI register content is retained except for overcurrent high and low detection levels and timing, which are reset to their default value (SOCL, SOCH, OCLT). The watchdog, overvoltage, overtemperature, and overcurrent circuitry (with default value for this one) are fully operational. Table 7. Output State During Fail-safe Mode RFS (k) High-side State 0 Fail-safe Mode Disabled 10 HS OFF 30 HS ON The Fail-safe mode can be detected by monitoring the WDTO bit D2 of the WDR register. This bit is logic [1] when the device is in Failsafe mode. The device can be brought out of the Fail-safe mode by transitioning the WAKE and RST pins from logic [1] to logic [0] or forcing the FSI pin to logic [0]. Table 6 summarizes the various methods for resetting the device from the latched Fail-safe mode. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 19 FUNCTIONAL DEVICE OPERATION PROTECTION AND DIAGNOSTIC FEATURES If the FSI pin is tied to GND, the Watchdog Fail-safe operation is disabled. LOSS OF VDD If the external 5.0 V supply is not within specification, or even disconnected, all register content is reset. The output can still be driven by the direct input IN. The 33982 uses the battery input to power the output MOSFET related current sense circuitry, and any other internal logic, providing fail-safe device operation with no VDD supplied. In this state, the watchdog, overvoltage, overtemperature, and overcurrent circuitry are fully operational with default values. Current recopy is active with the default current recopy value. FAULT MODE The 33982 indicates the following faults as they occur by driving the FS pin to logic [0]: • Overtemperature fault • Overvoltage and undervoltage fault • Open load fault • Overcurrent fault (high and low) The FS pin automatically returns to logic [1] when the fault condition is removed, except for overcurrent and in some cases undervoltage. Fault information is retained in the fault register and is available (and reset) via the SO pin during the first valid SPI communication (refer to Table 17). PROTECTION AND DIAGNOSTIC FEATURES OVERTEMPERATURE FAULT (NON-LATCHING) The 33982 incorporates overtemperature detection and shutdown circuitry in the output structure. Overtemperature detection is enabled when the output is in the ON state. For the output, an overtemperature fault (OTF) condition results in the faulted output turning OFF until the temperature falls below the TSD(HYS). This cycle continues indefinitely until action is taken by the MCU to shut OFF the output, or until the offending load is removed. When experiencing this fault, the OTF fault bit is set in the status register and cleared after either a valid SPI read or a power reset of the device. OVERVOLTAGE FAULT (NON-LATCHING) The 33982 shuts down the output during an overvoltage fault (OVF) condition on the VPWR pin. The output remains in the OFF state until the overvoltage condition is removed. When experiencing this fault, the OVF fault bit is set in bit OD1 and cleared after either a valid SPI read or a power reset of the device. The overvoltage protection and diagnostic can be disabled through the SPI (bit OV_dis). UNDERVOLTAGE SHUTDOWN (LATCHING OR NON-LATCHING) The output(s) latches off at some battery voltage below 6.0 V. As long as the VDD level stays within the normal specified range, the internal logic states within the device is sustained. In cases where the battery voltage drops below the undervoltage threshold, (VPWRUV) the output turns off, FS goes to logic [0], and the fault register UVF bit is set to 1. Two cases need to be considered when the battery level recovers: • If the output(s) command is (are) low, FS goes to logic [1], but the UVF bit remains set to 1 until the next read operation. • If the output command is ON, then FS remains at logic [0]. The output must be turned OFF and ON again to re-enable the state of output and release FS. The UVF bit remains set to 1 until the next read operation. The undervoltage protection can be disabled through the SPI (bit UV_dis = 1). In this case, the FS and UVF bits do not report any undervoltage fault condition and the output state is not changed as long as the battery voltage does not drop any lower than 2.5 V. OPEN LOAD FAULT (NON-LATCHING) The 33982 incorporates open load detection circuitry on the output. Output open load fault (OLF) is detected and reported as a fault condition when the output is disabled (OFF). The open load fault is detected and latched into the status register after the internal gate voltage is pulled low enough to turn OFF the output. The OLF fault bit is set in the status register. If the open load fault is removed, the status register is cleared after reading the register. The open load protection can be disabled through the SPI (bit OL_dis). It is recommended to disable the open load detection circuitry: (OL_dis bit sets to logic [1]) in case of a permanent open load fault condition. OVERCURRENT FAULT (LATCHING) The 33982 has eight programmable overcurrent low detection levels (IOCL) and two programmable overcurrent high detection levels (IOCH) for maximum device protection. The two selectable, simultaneously active overcurrent detection levels, defined by IOCH and IOCL, are illustrated in Figure 6. The eight different overcurrent low detection levels (IOCL0 : IOCL7) are likewise illustrated in Figure 6. 33982 20 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION PROTECTION AND DIAGNOSTIC FEATURES If the load current level ever reaches the selected overcurrent low detection level and the overcurrent condition exceeds the programmed overcurrent time period (tOCx), the device latches the output OFF. If at any time the current reaches the selected IOCH level, then the device immediately latches the fault and turn OFF the output, regardless of the selected tOCL driver. For both cases, the device output stays off indefinitely until the device is commanded OFF and then ON again. Table 8. Device Behavior in Case of Undervoltage High-side Switch (VPWR Battery Voltage) State UV Enable IN = 0 (Falling VPWR) UV Enable IN = 0 (Rising VPWR) UV Enable IN = 1 (Falling VPWR) Output State VPWR > VPWRUV OFF OFF ON OFF OFF ON FS State 1 1 1 0 1 1 SPI Fault Register UVF Bit 0 1 until next read 0 1 0 0 OFF OFF OFF OFF OFF ON 0 0 0 0 1 1 1 1 1 1 0 0 OFF OFF OFF OFF OFF ON 1 1 1 1 1 1 1 until next read 1 until next read 0 0 OFF OFF OFF OFF OFF OFF 1 1 1 1 1 1 1 until next read 1 until next read 1 until next read 0 0 Output State VPWRUV > FS State VPWR > UVPOR SPI Fault Register UVF Bit Output State UVPOR > VPWR FS State 1 > 2.5 V SPI Fault Register UVF Bit 1 until next read Output State FS State 2.5 V > VPWR > 0V UV Disable UV Disable UV Enable IN = 0 IN = 1 IN = 1 (Falling or Rising (Falling or Rising (Rising VPWR) VPWR) VPWR) SPI Fault Register UVF Bit 1 until next read Comments UV fault is not latched UV fault is not latched UV fault is latched Typical value; not guaranteed While VDD remains within specified range. = IN is equivalent to IN direct input or IN_spi SPI input. REVERSE BATTERY The output survives the application of reverse voltage as low as -16 V. Under these conditions, the output’s gate is enhanced to keep the junction temperature less than 150 °C. The ON resistance of the output is fairly similar to that in the Normal mode. No additional passive components are required. GROUND DISCONNECT PROTECTION In the event the 33982 ground is disconnected from load ground, the device protects itself and safely turns OFF the output regardless the state of the output at the time of disconnection. A 10 k resistor needs to be added between the WAKE pin and the rest of the circuitry in order to ensure that the device turns off in case of a ground disconnect and to prevent this pin to exceed its maximum ratings. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 21 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS SPI PROTOCOL DESCRIPTION The SPI interface has a full duplex, three-wire synchronous data transfer with four I /O lines associated with it: Serial Clock (SCLK), Serial Input (SI), Serial Output (SO), and Chip Select (CS). The SI / SO pins of the 33982 follow a first-in first-out (D7 / D0) protocol with both input and output words transferring the most significant bit (MSB) first. All inputs are compatible with 5.0 V CMOS logic levels. The SPI lines perform the following functions: SERIAL CLOCK (SCLK) The SCLK pin clocks the internal shift registers of the 33982 device. The serial input pin (SI) accepts data into the input shift register on the falling edge of the SCLK signal while the serial output pin (SO) shifts data information out of the SO line driver on the rising edge of the SCLK signal. It is important that the SCLK pin be in a logic LOW state whenever CS makes any transition. For this reason, it is recommended that the SCLK pin be in a logic [0] state whenever the device is not accessed (CS logic [1] state). SCLK has an active internal pull-down, IDWN. When CS is logic [1], signals at the SCLK and SI pins are ignored and SO is tri-stated (high-impedance). (See Figure 10 and Figure 11.) SERIAL INTERFACE (SI) This is a serial interface (SI) command data input pin. SI instruction is read on the falling edge of SCLK. An 8-bit stream of serial data is required on the SI pin, starting with D7 to D0. The internal registers of the 33982 are configured and controlled using a 4-bit addressing scheme, as shown in Table 9. Register addressing and configuration are described in Table 10. The SI input has an active internal pulldown, IDWN. SERIAL OUTPUT (SO) The SO pin is a tri-stateable output from the shift register. The SO pin remains in a high-impedance state until the CS pin is put into a logic [0] state. The SO data is capable of reporting the status of the output, the device configuration, and the state of the key inputs. The SO pin changes states on the rising edge of SCLK and reads out on the falling edge of SCLK. Fault and input status descriptions are provided in Table 16. CHIP SELECT (CS) The CS pin enables communication with the master microcontroller (MCU). When this pin is in a logic [0] state, the device is capable of transferring information to and receiving information from the MCU. The 33982 latches in data from the input shift registers to the addressed registers on the rising edge of CS. The device transfers status information from the power output to the shift register on the falling edge of CS. The SO output driver is enabled when CS is logic [0]. CS should transition from a logic [1] to a logic [0] state only when SCLK is a logic [0]. CS has an active internal pull-up, IUP. CSB CS SCLK SI SO SO D7 OD7 D6 OD6 D5 OD5 D4 OD4 D3 OD3 D2 OD2 D1 OD1 D0 OD0 1. RST a in logic [1] 1state theabove above operation. Notes 1. RSTB RSTis is a logic state during during the operation. NOTES: 2. D0, D1,relate D2, ...,toand relaterecent to the most recent ordered entryinto of data the SPSS 2. D7:D0 theD7most ordered entry of data theinto device. 3. OD0, OD1,relate OD2, ..., first 8 bits of ordered fault and data outdevice. 3. OD7:OD0 to and the OD7 first relate 8 bitstoofthe ordered fault and status datastatus out of the of the device. Figure 10. Single 8-Bit Word SPI Communication 33982 22 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS C S B CS SCLK S C L K SIS I D 7 S O SO D 6 O D 7 1 . N O T E S : D 5 O D 6 R R SST T B D 2 O D 5 D 1 O D 2 D 0 O D 1 D 7 * O D 0 D 6 * D 7 D 6 D 5 * D 5 D 2 * D 1 * D 2 D 1 D 0 * D 0 is in a lo g ic 1 s t a t e d u r in g t h e a b o v e o p e r a t io n . 2 . 0 , logic D 1 , D[1] 2 , .state . . , a n dduring D 7 r e la t e tabove o t h e m operation. o s t r e c e n t o r d e r e d e n t r y o f d a t a in t o t h e S P S S Notes 1. RST isD a the 3 . O D 0 , O D 1 , O D 2 , . . ., a n d O D 7 r e la t e t o t h e fir s t 8 b it s o f o r d e r e d f a u lt a n d s t a t u s d a t a o u t o f t h e d e v ic e . 2. D7:D0 4 . O relate D 0 , O Dto 1 , the O D most 2 , . . . , arecent n d O D ordered 7 r e p r e s eentry n t t h e of f i r sdata t 8 b into i t s o f the o r d device. e r e d f a u lt a n d s t a t u s d a t a o u t o f t h e S P S S 3. D7*:D0* relate to the previous 8 bits (last command word) of data that was previously shifted into the device. 4. OD7:OD0 relate to the first of 4ordered device. F I8 G bits U R E b . M U fault L T I Pand L E status 8 b i t Wdata O R out D Sof P the I C O M M U N IC A T IO N Figure 11. Multiple 8-Bit Word SPI Communication SERIAL INPUT COMMUNICATION SPI communication is accomplished using 8-bit messages. A message is transmitted by the MCU starting with the MSB, D7, and ending with the LSB, D0 (Table 9). Each incoming command message on the SI pin can be interpreted using the following bit assignments: the MSB (D7) is the watchdog bit and in some cases a register address bit; the next three bits, D6 : D4, are used to select the command register; and the remaining four bits, D3 : D0, are used to configure and control the output and its protection features. Multiple messages can be transmitted in succession to accommodate those applications where daisy chaining is desirable or to confirm transmitted data as long as the messages are all multiples of eight bits. Any attempt made to latch in a message that is not eight bits are ignored. The 33982 has defined registers, which are used to configure the device and to control the state of the output. Table 10, summarizes the SI registers. The registers are addressed via D6 : D4 of the incoming SPI word (Table 9). Table 9. SI Message Bit Assignment Bit Sig SI Msg Bit Message Bit Description MSB D7 Watchdog in: toggled to satisfy watchdog requirements; also used as a register address bit. D6 : D4 Register address bits. D3 : D1 Used to configure the inputs, outputs, and the device protection features and SO status content. D0 Used to configure the inputs, outputs, and the device protection features and SO status content. LSB Table 10. Serial Input Address and Configuration Bit Map Serial Input Data SI Register D7 D6 D5 D4 D3 D2 D1 D0 STATR x 0 0 0 0 SOA2 SOA1 SOA0 OCR x 0 0 1 0 0 CSNS EN IN_SPI SOCHLR x 0 1 0 SOCH SOCL2 SOCL1 SOCL0 CDTOLR x 0 1 1 OL_dis CD_dis OCLT1 OCLT0 DICR x 1 0 0 IN dis A/O OSDR 0 1 0 1 0 OSD2 OSD1 OSD0 WDR 1 1 0 1 0 0 WD1 WD0 NAR 0 1 1 0 0 0 0 0 UOVR 1 1 1 0 0 0 UV_dis OV_dis TEST x 1 1 1 FAST SR CSNS high Freescale Internal Use (Test) x = Don’t care. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 23 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS DEVICE REGISTER ADDRESSING The following section describes the possible register addresses and their impact on device operation. Address x000 — Status Register (STATR) The STATR register is used to read the device status and the various configuration register contents without disrupting the device operation or the register contents. The register bits D2, D1, and D0 determine the content of the first eight bits of SO data. In addition to the device status, this feature provides the ability to read the content of the OCR, SOCHLR, CDTOLR, DICR, OSDR, WDR, NAR, and UOVR registers. (Refer to the section entitled Serial Output Communication (Device Status Return Data) beginning on page 26.) Address x001 — Output Control Register (OCR) The OCR register allows the MCU to control the output through the SPI. Incoming message bit D0 (IN_SPI) reflects the desired states of the high-side output: a logic [1] enables the output switch and a logic [0] turns it OFF. A logic [1] on message bit D1 enables the Current Sense (CSNS) pin. Bits D2 and D3 must be logic [0]. Bit D7 is used to feed the watchdog if enabled. Address x010 — Select Overcurrent High and Low Register (SOCHLR) The SOCHLR register allows the MCU to configure the output overcurrent low and high detection levels, respectively. In addition to protecting the device, this slow blow fuse emulation feature can be used to optimize the load requirements to match system characteristics. Bits D2 : D0 are used to set the overcurrent low detection level to one of eight possible levels as defined in Table 11. Bit D3 is used to set the overcurrent high detection level to one of two levels as defined in Table 12. Table 11. Overcurrent Low Detection Levels SOCL2 (D2) SOCL1 (D1) SOCL0 (D0) Overcurrent Low Detection (Amperes) 0 0 0 50 0 0 1 45 0 1 0 40 0 1 1 35 1 0 0 30 1 0 1 25 1 1 0 20 1 1 1 15 Table 12. Overcurrent High Detection Levels SOCH (D3) Overcurrent High Detection (Amperes) 0 150 1 100 Address x011 — Current Detection Time and Open Load Register (CDTOLR) The CDTOLR register is used by the MCU to determine the amount of time the device allows an overcurrent low condition before output latches OFF occurs. Bits D1 and D0 allow the MCU to select one of four fault blanking times defined in Table 13. Note that these timeouts apply only to the overcurrent low detection levels. If the selected overcurrent high level is reached, the device latchs off within 20 s. Table 13. Overcurrent Low Detection Blanking Time OCLT [1:0] Timing 00 155 ms 01 10 ms 10 1.2 ms 11 150 s A logic [1] on bit D2 disables the overcurrent low (CD_dis) detection timeout feature. A logic [1] on bit D3 disables the open load (OL) detection feature. 33982 24 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Address x100 — Direct Input Control Register (DICR) The DICR register is used by the MCU to enable, disable, or configure the direct IN pin control of the output. A logic [0] on bit D1 enables the output for direct control by the IN pin. A logic [1] on bit D1 disables the output from direct control. While addressing this register, if the input was enabled for direct control, a logic [1] for the D0 bit results in a Boolean AND of the IN pin with its corresponding D0 message bit when addressing the OCR register. Similarly, a logic [0] on the D0 pin results in a Boolean OR of the IN pin with the corresponding message bits when addressing the OCR register. The DICR register is useful if there is a need to independently turn on and off several loads that are PWMed at the same frequency and duty cycle with only one PWM signal. This type of operation can be accomplished by connecting the pertinent direct IN pins of several devices to a PWM output port from the MCU, and configuring each of the outputs to be controlled via their respective direct IN pin. The DICR is then used to Boolean AND the direct IN(s) of each of the outputs with the dedicated SPI bit that also controls the output. Each configured SPI bit can now be used to enable and disable the common PWM signal from controlling its assigned output. A logic [1] on bit D2 is used to select the high ratio (CSR1, 1/40000) on the CSNS pin. The default value [0] is used to select the low ratio (CSR0, 1/5400). A logic [1] on bit D3 is used to select the high-speed slew rate. The default value [0] corresponds to the low-speed slew rate. Address 0101 — Output Switching Delay Register (OSDR) The OSDR register is used to configure the device with a programmable time delay that is active during Output On transitions that are initiated via the SPI (not via direct input). Whenever the input is commanded to transition from logic [0] to logic [1], the output are held OFF for the time delay configured in the OSDR register. The programming of the contents of this register has no effect on device Fail-safe mode operation. The default value of the OSDR register is 000, equating to no delay, since the switching delay time is 0 ms. This feature allows the user a way to minimize inrush currents, or surges, thereby allowing loads to be synchronously switched ON with a single command. Table 14 shows the eight selectable output switching delay times, which range from 0 ms to 525 ms. Table 14. Switching Delay OSD[2:0] (D2 : D0) Turn ON Delay (ms) 000 0 001 75 010 150 011 225 100 300 101 375 110 450 111 525 Address 1101 — Watchdog Register (WDR) The WDR register is used by the MCU to configure the watchdog timeout. Watchdog timeout is configured using bits D1 and D0 (Table 15). When bits D1 and D0 are programmed for the desired watchdog timeout period, the WD bit (D7) should be toggled as well to ensure that the new timeout period is programmed at the beginning of a new count sequence. Table 15. Watchdog Timeout WD [1:0] (D1: D0) Timing (ms) 00 620 01 310 10 2500 11 1250 Address 0110 — No Action Register (NAR) The NAR register can be used to no-operation fill SPI data packets in a daisy chain SPI configuration. This allows devices to not be affected by commands being clocked over a daisy-chained SPI configuration, and by toggling the WD bit (D7) the watchdog circuitry continues to be reset while no programming or data readback functions are being requested from the device. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 25 FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Address 1110 — Undervoltage / Overvoltage Register (UOVR) The UOVR register can be used to disable or enable the overvoltage and/or undervoltage protection. By default ([0]), both protections are active. When disabled, an undervoltage or overvoltage condition fault is not reported in bits D1 and D0 of the output fault register. Address x111 — TEST The TEST register is reserved for test and is not accessible with SPI during normal operation. SERIAL OUTPUT COMMUNICATION (DEVICE STATUS RETURN DATA) When the CS pin is pulled low, the output status register is loaded. Meanwhile, the data is clocked out MSB- (OD7-) first as the new message data is clocked into the SI pin. The first eight bits of data clocking out of the SO, and following a CS transition, are dependant upon the previously written SPI word. Any bits clocked out of the SO pin after the first eight are representative of the initial message bits clocked into the SI pin since the CS pin first transitioned to a logic [0]. This feature is useful for daisy chaining devices as well as message verification. A valid message length is determined following a CS transition of logic [0] to logic [1]. If there is a valid message length, the data is latched into the appropriate registers. A valid message length is a multiple of eight bits. At this time, the SO pin is tri-stated and the fault status register is now able to accept new fault status information. The output status register correctly reflects the status of the STATR-selected register data at the time the CS is pulled to a logic [0] during SPI communication and / or for the period of time since the last valid SPI communication, with the following exceptions: • The previous SPI communication was determined to be invalid. In this case, the status reports as though the invalid SPI communication never occurred. • Battery transients below 6.0 V resulting in an undervoltage shutdown of the outputs may result in incorrect data loaded into the status register. The SO data transmitted to the MCU during the first SPI communication following an undervoltage VPWR condition should be ignored. • The RST pin transition from a logic [0] to logic [1] while the WAKE pin is at logic [0] may result in incorrect data loaded into the status register. The SO data transmitted to the MCU during the first SPI communication following this condition should be ignored. Table 16. Serial Output Bit Map Descriptions Previous STATR D7, D2, D1, D0 Serial Output Returned Data SOA3 SOA2 SOA1 SOA0 OD7 OD6 OD5 OD4 OD3 OD2 OD1 OD0 x 0 0 0 WDin OTF OCHF OCLF OLF UVF OVF FAULT x 0 0 1 WDin 0 0 1 0 0 CSNS EN IN_SPI x 0 1 0 WDin 0 1 0 SOCH SOCL2 SOCL1 SOCL0 x 0 1 1 WDin 0 1 1 OL_dis CD_dis OCLT1 OCLT0 x 1 0 0 WDin 1 0 0 Fast SR CSNS High IN dis A/O 0 1 0 1 0 1 0 1 FSM_HS OSD2 OSD1 OSD0 1 1 0 1 1 1 0 1 0 WDTO WD1 WD0 0 1 1 0 0 1 1 0 0 IN Pin FSI Pin WAKE Pin 1 1 1 0 1 1 1 0 0 1110 UV_dis OV_dis x 1 1 1 WDin – – – See Table 2 – – – x = Don’t care. SERIAL OUTPUT BIT ASSIGNMENT The eight bits of serial output data depend on the previous serial input message, as explained in the following paragraphs. Table 16 summarizes the SO register content. Bit OD7 reflects the state of the watchdog bit (D7) addressed during the prior communication. The contents of bits OD6 : OD0 depend upon the bits D2 : D0 from the most recent STATR command SOA2 : SOA0. Previous Address SOA[2:0] = 000 If the previous three MSBs are 000, bits OD6 : OD0 reflect the current state of the Fault register (FLTR) (Table 17). 33982 26 Analog Integrated Circuit Device Data Freescale Semiconductor FUNCTIONAL DEVICE OPERATION LOGIC COMMANDS AND REGISTERS Previous Address SOA[2:0] = 001 The data in bits OD1 and OD0 contain CSNS EN and IN_SPI programmed bits, respectively. Previous Address SOA[2:0] = 010 The data in bit OD3 contain the programmed overcurrent high detection level (refer to Table 12), and the data in bits OD2, OD1, and OD0 contain the programmed overcurrent low detection levels (refer to Table 11). Table 17. Fault Register OD7 OD6 OD5 OD4 OD3 OD2 OD1 OD0 x OTF OCHF OCLF OLF UVF OVF FAULT OD7 (x) = Don’t care. OD6 (OTF) = Overtemperature Flag. OD5 (OCHF) = Overcurrent High Flag. (This fault is latched.) OD4 (OCLF) = Overcurrent Low Flag. (This fault is latched.) OD3 (OLF) = Open Load Flag. OD2 (UVF) = Undervoltage Flag. (This fault is latched or not latched.) OD1 (OVF) = Overvoltage Flag. OD0 (FAULT) = This flag reports a fault and is reset by a read operation. Note The FS pin reports a fault and is reset by a new Switch-ON command (via SPI or direct input IN). Previous Address SOA[2:0] = 011 The data returned in bits OD1 and OD0 are current values for the overcurrent fault blanking time, illustrated in Table 13. Bit OD2 reports when the overcurrent detection timeout feature is active. OD3 reports whether the open load circuitry is active. Previous Address SOA[2:0] =100 The returned data contain the programmed values in the DICR. Previous Address SOA[2:0] =101 • SOA3 = 0. The returned data contain the programmed values in the OSDR. Bit OD3 (FSM_HS) reflects the state of the output in the Fail-safe mode after a watchdog timeout occurs. • SOA3 = 1. The returned data contain the programmed values in the WDR. Bit OD2 (WDTO) reflects the status of the watchdog circuitry. If WDTO bit is logic [1], the watchdog has timed out and the device is in Fail-safe mode. If WDTO is logic [0], the device is in Normal mode (assuming device is powered and not in the Sleep mode), with the watchdog either enabled or disabled. Previous Address SOA[2:0] =110 • SOA3 = 0. OD2, OD1, and OD0 return the state of the IN, FSI, and WAKE pins, respectively (Table 18). Table 18. Pin Register OD2 OD1 OD0 IN Pin FSI Pin WAKE Pin • SOA3 = 1. The returned data contains the programmed values in the UOVR register. Bit OD1 reflects the state of the undervoltage protection, while bit OD0 reflects the state of the overvoltage protection (refer to Table 16). Previous Address SOA[2:0] = 111 Null Data. No previous register Read Back command received, so bits OD2, OD1, and OD0 are null, or 000. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 27 TYPICAL APPLICATIONS LOGIC COMMANDS AND REGISTERS TYPICAL APPLICATIONS VPWR VDD Voltage Regulator VDD VDD NC VPWR 10 k VDD 10 k MCU 10 100nF 10µF 2 I/O SCLK CS I/O SI SO I/O A/D VPWR 10k 10k 10k 10k 4 8 7 3 11 10k 9 5 1 6 1k VPWR VDD NC WAKE IN SCLK CS RST SO SI FS CSNS FSI NC 33982 HS HS 14 2.5µF 10nF 12 15 16 LOAD GND 13 RFS Figure 12. Typical Applications The loads must be chosen in order to guarantee the device normal operating condition for junction temperatures from -40 °C to 150 °C. In case of permanent short-circuit conditions, the duration and number of activation cycles must be limited with a dedicated MCU fault management, using the fault reporting through the SPI. When driving DC motor or Solenoid loads demanding multiple switching, an external recirculation device must be used to maintain the device in its safe operating area. Two application notes are available: • AN3274, which proposes safe configurations of the eXtreme switch devices in case of application faults, and to protect all circuitry with minimum external components. • AN2469, which provides guidelines for printed circuit board (PCB) design and assembly. Development effort is required by the end users to optimize the board design and PCB layout, in order to reach electromagnetic compatibility standards (emission and immunity). 33982 28 Analog Integrated Circuit Device Data Freescale Semiconductor PACKAGING SOLDERING INFORMATION PACKAGING SOLDERING INFORMATION SOLDERING INFORMATION The 33982 is packaged in a surface mount power package (PQFN), intended to be soldered directly on the printed circuit board. The AN2467 provides guidelines for Printed Circuit Board design and assembly. PACKAGE DIMENSIONS For the most current revision of the package, visit www.freescale.com and perform a keyword search on 98ARL10596D. Dimensions shown are provided for reference ONLY. 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 29 PACKAGING PACKAGE DIMENSIONS 33982 30 Analog Integrated Circuit Device Data Freescale Semiconductor PACKAGING PACKAGE DIMENSIONS 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 31 ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 4.0) ADDITIONAL DOCUMENTATION 33982 THERMAL ADDENDUM (REV 4.0) Introduction This thermal addendum is provided as a supplement to the 33982 technical datasheet. The addendum provides thermal performance information that may be critical in the design and development of system applications. All electrical, application, and packaging information is provided in the datasheet. High-side Switch Packaging and Thermal Considerations This package is a dual die package. There are two heat sources in the package independently heating with P1 and P2. This results in two junction temperatures, TJ1 and TJ2, and a thermal resistance matrix with RJAmn. For m, n = 1, RJA11 is the thermal resistance from Junction 1 to the reference temperature while only heat source 1 is heating with P1. For m = 1, n = 2, RJA12 is the thermal resistance from Junction 1 to the reference temperature while heat source 2 is heating with P2. This applies to RJ21 and RJ22, respectively. TJ1 TJ2 = RJA11 RJA12 RJA21 RJA22 Note For package dimensions, refer to 98ARL10521D. P1 P2 . 98ARL10521D 16-PIN PQFN 12 mm x 12 mm The stated values are solely for a thermal performance comparison of one package to another in a standardized environment. This methodology is not meant to and does not predict the performance of a package in an application-specific environment. Stated values were obtained by measurement and simulation according to the standards listed below. Standards Table 19. Thermal Performance Comparison 1 = Power Chip, 2 = Logic Chip [C/W] Thermal Resistance RJAmn (1), (2) m = 1, n=1 m = 1, n = 2 m = 2, n = 1 m = 2, n=2 20 16 39 RJBmn (2), (3) 6 2.0 26 RJAmn (1), (4) 53 40 73 <0.5 0.0 1.0 RJCmn (5) Notes: 1. Per JEDEC JESD51-2 at natural convection, still air condition. 2. 2s2p thermal test board per JEDEC JESD51-7and JESD51-5. 3. Per JEDEC JESD51-8, with the board temperature on the center trace near the power outputs. 4. Single layer thermal test board per JEDEC JESD51-3 and JESD51-5. 5. Thermal resistance between the die junction and the exposed pad, “infinite” heat sink attached to exposed pad. 33982 32 Analog Integrated Circuit Device Data Freescale Semiconductor ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 4.0) 1.0 0.2 1.0 0.2 * All measurements are in millimeters Note: Recommended via diameter is 0.5 mm. PTH (plated through hole) via must be plugged / filled with epoxy or solder mask in order to minimize void formation and to avoid any solder wicking into the via. Figure 13. Surface Mount for Power PQFN with Exposed Pads Transparent Top View IN WAKE CSNS 6 5 RST FSI 7 FS CS SI SCLK VDD SO NC 12 11 10 9 8 A 4 3 2 1 A 13 GND 14 VPWR 15 HS 16 HS 33982 Pin Connections 16-Pin PQFN 0.90 mm Pitch 12.0 mm x 12.0 mm Body Figure 14. Thermal Test Board 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 33 ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 4.0) Table 20. Device on Thermal Test Board Material: Single layer printed circuit board FR4, 1.6 mm thickness Cu traces, 0.07 mm thickness Outline: 80 mm x 100 mm board area, including edge connector for thermal testing Area A: Cu heat-spreading areas on board surface Ambient Conditions: Natural convection, still air Table 21. Thermal Resistance Performance Thermal Resistance RJAmn 1 = Power Chip, 2 = Logic Chip (C/W) Area A (mm2) m = 1, n=1 m = 1, n = 2 m = 2, n = 1 m = 2, n=2 0 55 42 74 300 41 32 66 600 39 29 65 RJAis the thermal resistance between die junction and ambient air. This device is a dual die package. Index m indicates the die that is heated. Index n refers to the number of the die where the junction temperature is sensed. Thermal Resistance [ºC/W] 80 70 60 50 40 30 20 x 10 0 0 RJA11 RJA22 RJA12 = RJA21 300 Heat spreading area A [mm²] 600 Figure 15. Device on Thermal Test Board RJA 33982 34 Analog Integrated Circuit Device Data Freescale Semiconductor ADDITIONAL DOCUMENTATION THERMAL ADDENDUM (REV 4.0) Thermal Resistance (°CW) 100 10 1 x 0.1 1.00E-03 1.00E-02 1.00E-01 1.00E+00 1.00E+01 Time(s) RJA11 RJA22 RJA12 = RJA21 1.00E+02 1.00E+03 1.00E+04 Figure 16. Transient Thermal Resistance RJA (1.0 W Step Response) Device on Thermal Test Board Area A = 600(mm2) 33982 Analog Integrated Circuit Device Data Freescale Semiconductor 35 REVISION HISTORY REVISION HISTORY REVISION DATE 10.0 2/2006 11.0 5/2006 12.0 1/2007 13.0 7/2007 14.0 6/2008 15.0 7/2009 16.0 10/2009 17.0 5/2012 18.0 DESCRIPTION OF CHANGES • • • • • • • • Implemented Revision History page Deletion of MC33982 part number, replaced with MC33982B. Corrected Pin Connections to the proper case outline Added final sentence to Open Load Fault (Non-Latching) Corrected heading labels on Input Timing Switching Characteristics Changed labels in the Typical Applications drawing Corrected Package Dimensions to Revision C Added Thermal Addendum (Rev 4.0). • Added RoHS logo to the data sheet • • • • Added Functional Internal Block Description Minor corrections to Serial Output Bit Map Descriptions and Device Behavior in Case of Undervoltage Changed the labeling header on Dynamic Electrical Characteristics from 150 to 125 degrees C Updated Freescale form and style • Added Current Sense Leakage to Static Electrical Characteristics table (Table 3). • • • • • • • Added MC33982C to the ordering information Added a Device Variations table Removed MC33982BPNA Updated orderable part number from MC33982CPNA to MC33982CHFK Updated (7) Updated Soldering Information Updated Freescale form and style 10/2012 • Made limit changes to Dynamic Electrical Characteristics min, typ, and max. 9/2014 • Corrected Orderable Part number information. • Updated Freescale form and style • Updated back page 33982 36 Analog Integrated Circuit Device Data Freescale Semiconductor How to Reach Us: Information in this document is provided solely to enable system and software implementers to use Freescale products. Home Page: freescale.com There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based Web Support: freescale.com/support Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no on the information in this document. warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others. Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address: freescale.com/SalesTermsandConditions. Freescale and the Freescale logo are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off. SMARTMOS is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their respective owners. © 2014 Freescale Semiconductor, Inc. Document Number: MC33982 Rev. 18.0 9/2014