PHILIPS PESD5V0L5UV

DISCRETE SEMICONDUCTORS
DATA SHEET
M3D744
PESD3V3L5UV; PESD5V0L5UV
Low capacitance 5-fold ESD
protection diode arrays in SOT666
package
Product specification
2004 Mar 23
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
FEATURES
PESD3V3L5UV;
PESD5V0L5UV
QUICK REFERENCE DATA
• Uni-directional ESD protection of up to five lines
SYMBOL
• Bi-directional ESD protection of up to four lines
VRWM
• Low diode capacitance
PARAMETER
UNIT
reverse standoff voltage
• Maximum peak pulse power: Ppp = 25 W at tp = 8/20µs
• Low clamping voltage: VCL(R) = 12 V at Ipp = 2.5 A
VALUE
Cd
PESD3V3L5UV
3.3
V
PESD5V0L5UV
5
V
diode capacitance
• Ultra low leakage current: IRM = 8 nA at VRWM = 5 V
PESD3V3L5UV
22
pF
• ESD protection > 20 kV
PESD5V0L5UV
16
pF
• IEC 61000-4-2; level 4 (ESD)
number of protected lines 5
• IEC 61000-4-5 (surge); Ipp = 2.5 A at Tp = 8/20 µs.
PINNING
APPLICATIONS
PIN
• Cellular handsets and accessories
DESCRIPTION
1
cathode 1
2
common anode
• Computers and peripherals
3
cathode 2
• Communications systems
4
cathode 3
• Audio and video equipment.
5
cathode 4
6
cathode 5
• Portable electronics
DESCRIPTION
Low capacitance 5-fold ESD protection array in the ultra
small SOT666 plastic package designed to protect up to
five transmission or data lines from the damage caused by
Electrostatic Discharge (ESD).
6
5
4
1
3
4
MARKING
5
MARKING CODE(1)
TYPE NUMBER
PESD3V3L5UV
*E1
PESD5V0L5UV
*E2
2
6
1
2
3
001aaa213
sym011
Note
1. * = p: Made in Hong Kong.
* = t: Made in Malaysia.
* = W: Made in China.
Fig.1 Simplified outline (SOT666) and symbol.
ORDERING INFORMATION
PACKAGE
TYPE NUMBER
NAME
DESCRIPTION
VERSION
PESD3V3L5UV
−
plastic surface mounted package; 6 leads
SOT666
PESD5V0L5UV
−
plastic surface mounted package; 6 leads
SOT666
2004 Mar 23
2
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
Per diode
Ppp
peak pulse power
8/20 µs pulse; notes 1 and 2
−
Ipp
peak pulse current
8/20 µs pulse; notes 1 and 2
−
2.5
A
Tj
junction temperature
−
150
°C
Tamb
operation ambient temperature
−65
+150
°C
Tstg
storage temperature
−65
+150
°C
25
W
Notes
1. Non-repetitive current pulse 8/20 µs exponentially decaying waveform; see Fig.2.
2. Measured from any of pins 1, 3, 4, 5 or 6 to pin 2.
ESD maximum ratings
SYMBOL
PARAMETER
CONDITIONS
VALUE
UNIT
IEC 61000-4-2 (contact
discharge); notes 1 and 2
20
kV
HBM MIL-Std 883
10
kV
Per diode
ESD
electrostatic discharge capability
Notes
1. Device stressed with ten non-repetitive Electrostatic Discharge (ESD) pulses; see Fig.3.
2. Measured from any of pins 1, 3, 4, 5 or 6 to pin 2.
ESD standards compliance
ESD STANDARD
CONDITIONS
IEC 61000-4-2, level 4 (ESD)
> 15 kV (air); > 8 kV (contact)
HBM MIL-Std 883, class 3
> 4 kV
2004 Mar 23
3
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
001aaa191
MLE218
120
Ipp
handbook, halfpage
Ipp
(%)
100 % Ipp; 8 µs
100 %
90 %
80
e−t
50 % Ipp; 20 µs
40
10 %
0
0
10
20
30
t (µs)
tr = 0.7 to 1 ns
40
30 ns
60 ns
Fig.2
8/20 µs pulse waveform according to
IEC 61000-4-5.
2004 Mar 23
Fig.3
4
Electrostatic Discharge (ESD) pulse
waveform according to IEC 61000-4-2.
t
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
CHARACTERISTICS
Tj = 25 °C unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Per diode
VRWM
IRM
reverse stand-off voltage
PESD3V3L5UV
−
−
3.3
V
PESD5V0L5UV
−
−
5
V
VRWM = 3.3 V
−
75
300
nA
VRWM = 5 V
−
5
25
nA
5.3
5.6
5.9
V
6.4
6.8
7.2
V
−
22
28
pF
−
16
19
pF
Ipp = 1 A
−
−
10
V
Ipp = 2.5 A
−
−
12
V
Ipp = 1 A
−
−
10
V
Ipp = 2.5 A
−
−
12
V
PESD3V3L5UV
−
−
200
Ω
PESD5V0L5UV
−
−
100
Ω
reverse leakage current
PESD3V3L5UV
PESD5V0L5UV
VBR
breakdown voltage
IR = 1 mA
PESD3V3L5UV
PESD5V0L5UV
Cd
diode capacitance
PESD3V3L5UV
f = 1 MHz; VR = 0 V;
see Fig.5
PESD5V0L5UV
VCL(R)
clamping voltage
PESD3V3L5UV
PESD5V0L5UV
rdiff
differential resistance
notes 1 and 2
IR = 1 mA
Notes
1. Non-repetitive current pulse 8/20 µs exponentially decaying waveform; see Fig.2.
2. Measured from any of pins 1, 3, 4, 5 or 6 to pin 2.
2004 Mar 23
5
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
GRAPHICAL DATA
001aaa208
102
001aaa209
Ppp(Tj)
Ppp(Tj =25°C)
1.0
Ppp
(W)
0.8
0.6
10
0.4
0.2
1
1
102
10
103
0
104
0
50
100
t p (µs)
Tj (°C)
150
Tamb = 25 °C.
Ipp = 8/20 µs exponentially decaying waveform; see Fig.2.
Fig.5
Fig.4
Relative variation of peak pulse power as a
function of junction temperature; typical
values.
Peak pulse power dissipation as a function
of pulse time; typical values.
001aaa210
25
001aaa211
10
Cd
(pF)
IR(Tj)
IR(Tj =25°C)
20
15
(1)
1
(2)
10
5
10−1
−75
0
0
1
2
3
4
5
VR (V)
−25
25
75
125
175
Tj (°C)
(1) PESD3V3L5UV.
(2) PESD5V0L5UV.
f = 1 MHz; Tamb = 25 °C.
Fig.7
Fig.6
Diode capacitance as a function of reverse
voltage; typical values.
2004 Mar 23
6
Relative variation of reverse leakage
current as a function of junction
temperature; typical values.
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
ESD TESTER
RZ
450 Ω
RG 223/U
50 Ω coax
CZ
4 GHz DIGITAL
OSCILLOSCOPE
10×
ATTENUATOR
50 Ω
note 1
D.U.T.: PESDxL5UV
IEC 61000-4-2 network
CZ = 150 pF; RZ = 330 Ω
Note 1: Attenuator is only used for open
socket high voltage measurements
vertical scale = 200 V/div
horizontal scale = 50 ns/div
vertical scale = 5 V/div
horizontal scale = 50 ns/div
GND1
GND
GND2
unclamped +1 kV ESD voltage waveform
(IEC61000-4-2 network)
PESD5V0L5UV
PESD3V3L5UV
clamped +1 kV ESD voltage waveform
(IEC61000-4-2 network)
GND
GND
vertical scale = 200 V/div
horizontal scale = 50 ns/div
vertical scale = 5 V/div
horizontal scale = 50 ns/div
unclamped −1 kV ESD voltage waveform
(IEC61000-4-2 network)
clamped −1 kV ESD voltage waveform
(IEC61000-4-2 network)
Fig.8 ESD clamping test setup and waveforms.
2004 Mar 23
7
001aaa219
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
APPLICATION INFORMATION
The PESDxL5UV is designed for the uni-directional protection of up to five lines or bi-directional protection of four lines
from the damage caused by Electrostatic Discharge (ESD) and surge pulses. The PESDxL5UV may be used on lines
where the signal polarities are above or below ground. PESDxL5UV can withstand and provides protection from a surge
of 25 watts peak pulse power per line for a 8/20 µs waveform.
Typical application
high speed data lines
high speed data lines
PESDxL5UV
PESDxL5UV
GND
GND
001aaa217
001aaa215
Fig.9
Typical application for uni-directional
protection of five lines.
Fig.10 Typical application for bi-directional
protection of four lines.
Circuit board layout and protection device placement
Circuit board layout is critical for the suppression of ESD,
Electrical Fast Transient (EFT) and surge transients. The
following guidelines are recommended:
1. The protection device should be placed as closely as
possible to the input terminal or connector.
2. The path length between the protection device and the
protected line should be as short as possible.
3. Parallel signal paths should be kept to a minimum.
4. Running protection conductors in parallel with
unprotected conductor should be avoided.
5. All printed-circuit board conductive loops (including
power and group loops) should be kept to a minimum.
6. The length of the transient return path to ground
should be kept to a minimum.
7. The use of shared transient return paths to a common
ground point should be avoided.
8. Ground planes should be used whenever possible.
9. For multilayer printed-circuit boards, ground vias
should be used.
2004 Mar 23
8
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
PACKAGE OUTLINE
Plastic surface mounted package; 6 leads
SOT666
D
E
A
X
Y S
S
HE
6
5
4
pin 1 index
A
1
2
e1
c
3
bp
w M A
Lp
e
detail X
0
1
2 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
bp
c
D
E
e
e1
HE
Lp
w
y
mm
0.6
0.5
0.27
0.17
0.18
0.08
1.7
1.5
1.3
1.1
1.0
0.5
1.7
1.5
0.3
0.1
0.1
0.1
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
EIAJ
ISSUE DATE
01-01-04
01-08-27
SOT666
2004 Mar 23
EUROPEAN
PROJECTION
9
Philips Semiconductors
Product specification
Low capacitance 5-fold ESD protection
diode arrays in SOT666 package
PESD3V3L5UV;
PESD5V0L5UV
DATA SHEET STATUS
LEVEL
DATA SHEET
STATUS(1)
PRODUCT
STATUS(2)(3)
Development
DEFINITION
I
Objective data
II
Preliminary data Qualification
This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
III
Product data
This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Relevant changes will
be communicated via a Customer Product/Process Change Notification
(CPCN).
Production
This data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.
DEFINITIONS
DISCLAIMERS
Short-form specification  The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Life support applications  These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips
Semiconductors customers using or selling these products
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Limiting values definition  Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
at these or at any other conditions above those given in the
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Right to make changes  Philips Semiconductors
reserves the right to make changes in the products including circuits, standard cells, and/or software described or contained herein in order to improve design
and/or performance. When the product is in full production
(status ‘Production’), relevant changes will be
communicated via a Customer Product/Process Change
Notification (CPCN). Philips Semiconductors assumes no
responsibility or liability for the use of any of these
products, conveys no licence or title under any patent,
copyright, or mask work right to these products, and
makes no representations or warranties that these
products are free from patent, copyright, or mask work
right infringement, unless otherwise specified.
Application information  Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
no representation or warranty that such applications will be
suitable for the specified use without further testing or
modification.
2004 Mar 23
10
Philips Semiconductors – a worldwide company
Contact information
For additional information please visit http://www.semiconductors.philips.com.
Fax: +31 40 27 24825
For sales offices addresses send e-mail to: [email protected].
SCA76
© Koninklijke Philips Electronics N.V. 2004
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license
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Printed in The Netherlands
R76/01/pp11
Date of release: 2004
Mar 23
Document order number:
9397 750 12254