PHILIPS PHP45NQ10T

Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
FEATURES
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
SYMBOL
QUICK REFERENCE DATA
• ’Trench’ technology
• Very low on-state resistance
• Fast switching
• Low thermal resistance
d
VDSS = 100 V
ID = 47 A
g
RDS(ON) ≤ 25 mΩ
s
GENERAL DESCRIPTION
N-channel enhancement mode field-effect power transistor in a plastic envelope using ’trench’ technology.
Applications:• d.c. to d.c. converters
• switched mode power supplies
The PHP45NQ10T is supplied in the SOT78 (TO220AB) conventional leaded package.
The PHB45NQ10T is supplied in the SOT404 (D2PAK) surface mounting package.
The PHW45NQ10T is supplied in the SOT429 (TO247) conventional leaded package.
PINNING
PIN
SOT404 (D2PAK)
SOT78 (TO220AB)
DESCRIPTION
SOT429 (TO247)
tab
tab
1
gate
2
drain1
3
source
2
tab
drain
1
1 23
1
3
2
3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDSS
VDGR
VGS
ID
Drain-source voltage
Drain-gate voltage
Gate-source voltage
Continuous drain current
Tj = 25 ˚C to 175˚C
Tj = 25 ˚C to 175˚C; RGS = 20 kΩ
IDM
PD
Tj, Tstg
Pulsed drain current
Total power dissipation
Operating junction and
storage temperature
- 55
100
100
± 20
47
33
188
150
175
V
V
V
A
A
A
W
˚C
Tmb = 25 ˚C; VGS = 10 V
Tmb = 100 ˚C; VGS = 10 V
Tmb = 25 ˚C
Tmb = 25 ˚C
1 It is not possible to make connection to pin 2 of the SOT404 package.
August 1999
1
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
AVALANCHE ENERGY LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134)
SYMBOL PARAMETER
EAS
Non-repetitive avalanche
energy
IAS
Non-repetitive avalanche
current
CONDITIONS
MIN.
MAX.
UNIT
-
260
mJ
-
47
A
Unclamped inductive load, IAS = 40 A;
tp = 100 µs; Tj prior to avalanche = 25˚C;
VDD ≤ 25 V; RGS = 50 Ω; VGS = 10 V; refer
to fig:15
THERMAL RESISTANCES
SYMBOL PARAMETER
Rth j-mb
Rth j-a
Thermal resistance junction
to mounting base
Thermal resistance junction
to ambient
CONDITIONS
MIN.
SOT78 package, in free air
SOT429 package, in free air
SOT404 package, pcb mounted, minimum
footprint
TYP. MAX. UNIT
-
-
1
K/W
-
60
45
50
-
K/W
K/W
K/W
ELECTRICAL CHARACTERISTICS
Tj= 25˚C unless otherwise specified
SYMBOL PARAMETER
CONDITIONS
V(BR)DSS
VGS = 0 V; ID = 0.25 mA;
VGS(TO)
Drain-source breakdown
voltage
Gate threshold voltage
Tj = -55˚C
VDS = VGS; ID = 1 mA
Tj = 175˚C
Tj = -55˚C
RDS(ON)
IGSS
IDSS
Drain-source on-state
VGS = 10 V; ID = 25 A
resistance
Gate source leakage current VGS = ±10 V; VDS = 0 V
Zero gate voltage drain
VDS = 100 V; VGS = 0 V;
current
Tj = 175˚C
Tj = 175˚C
MIN.
TYP. MAX. UNIT
100
89
2
1
-
3
22
0.02
0.05
-
4
6
25
68
100
10
500
V
V
V
V
V
mΩ
mΩ
nA
µA
µA
Qg(tot)
Qgs
Qgd
Total gate charge
Gate-source charge
Gate-drain (Miller) charge
ID = 45 A; VDD = 80 V; VGS = 10 V
-
61
13
25
-
nC
nC
nC
td on
tr
td off
tf
Turn-on delay time
Turn-on rise time
Turn-off delay time
Turn-off fall time
VDD = 50 V; RD = 1.8 Ω;
VGS = 10 V; RG = 5.6 Ω
Resistive load
-
18
72
69
58
-
ns
ns
ns
ns
Ld
Ld
Internal drain inductance
Internal drain inductance
-
3.5
4.5
-
nH
nH
Ls
Internal source inductance
Measured tab to centre of die
Measured from drain lead to centre of die
(SOT78 and SOT429 packages)
Measured from source lead to source
bond pad
-
7.5
-
nH
Ciss
Coss
Crss
Input capacitance
Output capacitance
Feedback capacitance
VGS = 0 V; VDS = 25 V; f = 1 MHz
-
2600
340
195
-
pF
pF
pF
August 1999
2
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25˚C unless otherwise specified
SYMBOL PARAMETER
VSD
Continuous source current
(body diode)
Pulsed source current (body
diode)
Diode forward voltage
trr
Qrr
Reverse recovery time
Reverse recovery charge
IS
ISM
August 1999
CONDITIONS
MIN.
TYP. MAX. UNIT
-
-
47
A
-
-
188
A
IF = 25 A; VGS = 0 V
-
0.87
1.2
V
IF = 20 A; -dIF/dt = 100 A/µs;
VGS = 0 V; VR = 25 V
-
82
0.26
-
ns
µC
3
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
Normalised Power Derating, PD (%)
Transient thermal impedance, Zth j-mb (K/W)
1
100
D = 0.5
90
0.2
80
0.1
0.1
70
0.05
60
0.02
50
40
P
D
0.01
30
D = tp/T
tp
single pulse
20
T
10
0.001
1E-06
0
0
25
50
75
100
125
Mounting Base temperature, Tmb (C)
150
175
1E-05
1E-04
1E-03
1E-02
1E-01
1E+00
Pulse width, tp (s)
Fig.1. Normalised power dissipation.
PD% = 100⋅PD/PD 25 ˚C = f(Tmb)
Fig.4. Transient thermal impedance.
Zth j-mb = f(t); parameter D = tp/T
Drain Current, ID (A)
40
Normalised Current Derating, ID (%)
VGS = 10V
100
35
90
8V
Tj = 25 C
6V
30
80
70
25
60
5V
50
20
40
15
4.8 V
10
4.6 V
30
20
10
4.4 V
5
4.2 V
4V
0
0
25
50
75
100
125
Mounting Base temperature, Tmb (C)
150
0
175
0
Fig.2. Normalised continuous drain current.
ID% = 100⋅ID/ID 25 ˚C = f(Tmb); VGS ≥ 10 V
0.4
0.16
tp = 10 us
1.8
2
4.6 V
Tj = 25 C
4.8 V
0.12
100 us
D.C.
4.4 V
4V
0.14
10
1.6
Drain-Source On Resistance, RDS(on) (Ohms)
4.2 V
RDS(on) = VDS/ ID
100
0.6
0.8
1
1.2
1.4
Drain-Source Voltage, VDS (V)
Fig.5. Typical output characteristics, Tj = 25 ˚C.
ID = f(VDS)
Peak Pulsed Drain Current, IDM (A)
1000
0.2
5V
0.1
1 ms
0.08
10 ms
0.06
100 ms
1
0.04
8V
6V
0.02
VGS = 10V
0.1
0
1
10
100
Drain-Source Voltage, VDS (V)
1000
0
Fig.3. Safe operating area
ID & IDM = f(VDS); IDM single pulse; parameter tp
August 1999
2
4
6
8
10
12
Drain Current, ID (A)
14
16
18
20
Fig.6. Typical on-state resistance, Tj = 25 ˚C.
RDS(ON) = f(ID)
4
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
Drain current, ID (A)
4.5
50
VDS > ID X RDS(ON)
45
Threshold Voltage, VGS(TO) (V)
4
40
3.5
35
3
30
maximum
typical
2.5
25
minimum
2
20
1.5
15
175 C
10
Tj = 25 C
1
0.5
5
0
0
0
1
2
3
4
5
6
-60
-40
-20
Gate-source voltage, VGS (V)
0
20
40
60
80
100 120 140 160 180
Junction Temperature, Tj (C)
Fig.7. Typical transfer characteristics.
ID = f(VGS)
Fig.10. Gate threshold voltage.
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
Transconductance, gfs (S)
50
Drain current, ID (A)
1.0E-01
VDS > ID X RDS(ON)
45
Tj = 25 C
40
1.0E-02
35
175 C
30
minimum
1.0E-03
25
typical
1.0E-04
20
maximum
15
1.0E-05
10
5
1.0E-06
0
0
5
10
15
20
25
30
35
Drain current, ID (A)
40
45
0
50
Fig.8. Typical transconductance, Tj = 25 ˚C.
gfs = f(ID)
0.5
1
1.5
2
2.5
3
3.5
Gate-source voltage, VGS (V)
4
4.5
5
Fig.11. Sub-threshold drain current.
ID = f(VGS); conditions: Tj = 25 ˚C
Normalised On-state Resistance
2.9
2.7
2.5
2.3
2.1
1.9
1.7
1.5
1.3
1.1
0.9
0.7
0.5
10000
Capacitances, Ciss, Coss, Crss (pF)
Ciss
1000
Coss
100
Crss
10
-60
-40
-20
0
20 40 60 80 100 120 140 160 180
Junction temperature, Tj (C)
0.1
Fig.9. Normalised drain-source on-state resistance.
RDS(ON)/RDS(ON)25 ˚C = f(Tj)
August 1999
1
10
Drain-Source Voltage, VDS (V)
100
Fig.12. Typical capacitances, Ciss, Coss, Crss.
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
5
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
Maximum Avalanche Current, IAS (A)
100
Gate-source voltage, VGS (V)
15
14
13
12
11
10
9
8
7
6
5
4
3
2
1
0
ID = 45A
Tj = 25 C
VDD = 20 V
25 C
VDD = 80 V
0
5
10
1
0.001
10 15 20 25 30 35 40 45 50 55 60 65 70 75 80
Gate charge, QG (nC)
Tj prior to avalanche = 150 C
0.01
0.1
1
10
Avalanche time, tAV (ms)
Fig.13. Typical turn-on gate-charge characteristics.
VGS = f(QG)
Fig.15. Maximum permissible non-repetitive
avalanche current (IAS) versus avalanche time (tAV);
unclamped inductive load
Source-Drain Diode Current, IF (A)
50
VGS = 0 V
45
40
35
30
175 C
25
Tj = 25 C
20
15
10
5
0
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9
1
1.1 1.2 1.3 1.4 1.5
Source-Drain Voltage, VSDS (V)
Fig.14. Typical reverse diode current.
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
August 1999
6
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
MECHANICAL DATA
Plastic single-ended package; heatsink mounted; 1 mounting hole; 3-lead TO-220
E
SOT78
A
A1
P
q
D1
D
L1
L2(1)
Q
b1
L
1
2
e
e
3
c
b
0
5
10 mm
scale
DIMENSIONS (mm are the original dimensions)
(1)
UNIT
A
A1
b
b1
c
D
D1
E
mm
4.5
4.1
1.39
1.27
0.9
0.7
1.3
1.0
0.7
0.4
15.8
15.2
6.4
5.9
10.3
9.7
e
L
L1
2.54
15.0
13.5
3.30
2.79
L2
max.
P
q
Q
3.0
3.8
3.6
3.0
2.7
2.6
2.2
Note
1. Terminals in this zone are not tinned.
OUTLINE
VERSION
SOT78
REFERENCES
IEC
JEDEC
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
97-06-11
TO-220
Fig.16. SOT78 (TO220AB); pin 2 connected to mounting base (Net mass:2g)
Notes
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static
discharge during transport or handling.
2. Refer to mounting instructions for SOT78 (TO220AB) package.
3. Epoxy meets UL94 V0 at 1/8".
August 1999
7
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
MECHANICAL DATA
Plastic single-ended surface mounted package (Philips version of D2-PAK); 3 leads
(one lead cropped)
SOT404
A
A1
E
mounting
base
D1
D
HD
2
Lp
1
3
c
b
e
e
Q
0
2.5
5 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
A1
b
c
mm
4.50
4.10
1.40
1.27
0.85
0.60
0.64
0.46
OUTLINE
VERSION
D
max.
D1
E
11
1.60
1.20
10.30
9.70
e
Lp
HD
Q
2.54
2.90
2.10
15.40
14.80
2.60
2.20
REFERENCES
IEC
JEDEC
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
98-12-14
99-06-25
SOT404
Fig.17. SOT404 surface mounting package. Centre pin connected to mounting base.
Notes
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static
discharge during transport or handling.
2. Refer to SMD Footprint Design and Soldering Guidelines, Data Handbook SC18.
3. Epoxy meets UL94 V0 at 1/8".
August 1999
8
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
MOUNTING INSTRUCTIONS
Dimensions in mm
11.5
9.0
17.5
2.0
3.8
5.08
Fig.18. SOT404 : soldering pattern for surface mounting.
August 1999
9
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
MECHANICAL DATA
Plastic single-ended through-hole package; heatsink mounted; 1 mounting hole; 3-lead TO-247
SOT429
α
E
P
A
A1
β
q
S
R
D
Y
L1(1)
Q
b2
L
1
2
3
c
w M
b
b1
e
e
0
10
20 mm
scale
DIMENSIONS (mm are the original dimensions)
UNIT
A
A1
b
b1
b2
c
D
E
e
L
mm
5.3
4.7
1.9
1.7
1.2
0.9
2.2
1.8
3.2
2.8
0.9
0.6
21
20
16
15
5.45
16
15
(1)
L1
4.0
3.6
P
Q
q
R
S
w
Y
α
β
3.7
3.3
2.6
2.4
5.3
3.5
3.3
7.5
7.1
0.4
15.7
15.3
6°
4°
17°
13°
Note
1. Tinning of terminals are uncontrolled within zone L1.
OUTLINE
VERSION
SOT429
REFERENCES
IEC
JEDEC
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
98-04-07
99-08-04
TO-247
Fig.19. SOT429; pin 2 connected to mounting base
Notes
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent
damage to MOS gate oxide.
2. Refer to mounting instructions for SOT429 envelope.
3. Epoxy meets UL94 V0 at 1/8".
August 1999
10
Rev 1.000
Philips Semiconductors
Product specification
N-channel TrenchMOS transistor
PHB45NQ10T, PHP45NQ10T
PHW45NQ10T
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and
operation of the device at these or at any other conditions above those given in the Characteristics sections of
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
 Philips Electronics N.V. 1999
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the
copyright owner.
The information presented in this document does not form part of any quotation or contract, it is believed to be
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any
consequence of its use. Publication thereof does not convey nor imply any license under patent or other
industrial or intellectual property rights.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices or systems where malfunction of these
products can be reasonably expected to result in personal injury. Philips customers using or selling these products
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting
from such improper use or sale.
August 1999
11
Rev 1.000