PHILIPS BLF900-110

DISCRETE SEMICONDUCTORS
DATA SHEET
M3D379
M3D461
BLF900-110; BLF900S-110
Base station LDMOS transistors
Product specification
Supersedes data of 2003 Sep 22
2004 Feb 04
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
FEATURES
APPLICATIONS
• Typical CDMA IS95 performance at standard settings
with a supply voltage of 27 V, frequency of 881.5 MHz
and IDQ of 700 mA; adjacent channel bandwidth is
30 kHz, adjacent channel at ± 750 kHz:
• RF power amplifier for GSM, EDGE and CDMA base
stations and multicarrier operations in the
800 to 1000 MHz frequency range.
– Output power = 24 W (AV)
DESCRIPTION
– Gain = 15 dB
110 W LDMOS power transistor for base station
applications at frequencies from 800 to 1000 MHz.
– Efficiency = 27%
– ACPR = −45 dBc at 750 kHz and BW = 30 kHz.
• 110 W CW performance
• Easy power control
• Excellent ruggedness
• High power gain
• Excellent thermal stability
• Designed for broadband operation (800 to 1000 MHz)
• Internally matched for ease of use.
PINNING - SOT502A
PINNING - SOT502B
PIN
PIN
DESCRIPTION
DESCRIPTION
1
drain
1
drain
2
gate
2
gate
3
source; connected to flange
3
source; connected to flange
handbook, halfpage
1
1
3
2
Top view
2
3
Top view
MBL105
MBK394
Leads are gold-plated.
Fig.1 Simplified outline SOT502A (BLF900-110).
Fig.2 Simplified outline SOT502B (BLF900S-110).
QUICK REFERENCE DATA
Typical RF performance at Th = 25 °C in a common source test circuit.
MODE OF OPERATION
2-tone, class-AB
CDMA (IS95)
2004 Feb 04
f
(MHz)
VDS
(V)
PL
(W)
Gp
(dB)
ηD
(%)
d3
(dBc)
ACPR 750
(dBc)
f1 = 890.0; f2 = 890.1
27
100 (PEP)
17
38
−33
−
881.5
27
24 (AV)
15
27
−
−45
2
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
ORDERING INFORMATION
TYPE NUMBER
PACKAGE
NAME
DESCRIPTION
VERSION
BLF900-110
−
Flanged LDMOST ceramic package; 2 mounting holes; 2 leads
SOT502A
BLF900S-110
−
Earless flanged LDMOST ceramic package; 2 leads
SOT502B
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 60134).
SYMBOL
PARAMETER
MIN.
MAX.
UNIT
VDS
drain-source voltage
−
75
V
VGS
gate-source voltage
−
±15
V
Tstg
storage temperature
−65
+150
°C
Tj
junction temperature
−
200
°C
THERMAL CHARACTERISTICS
SYMBOL
Rth(j-c)
PARAMETER
thermal resistance from junction to case
CONDITIONS
VALUE
UNIT
Th = 25 °C, PL = 160 W (AV), note 1
0.9
K/W
Note
1. Thermal resistance is determined under specified RF operating conditions.
CHARACTERISTICS
Tj = 25 °C unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
V(BR)DSS
drain-source breakdown voltage
VGS = 0; ID = 3 mA
75
−
−
V
VGSth
gate-source threshold voltage
VDS = 10 V; ID = 250 mA
4.5
−
5.5
V
IDSS
drain-source leakage current
VGS = 0; VDS = 28 V
−
−
3
µA
IDSX
on-state drain current
VGS = VGSth + 9 V; VDS = 10 V
31
−
−
A
IGSS
gate leakage current
VGS = ±15 V; VDS = 0
−
−
0.5
µA
gfs
forward transconductance
VDS = 20 V; ID = 7.5 A
−
7
−
S
RDSon
drain-source on-state resistance
VGS = VGSth + 9 V; ID = 9 A
−
90
−
mΩ
2004 Feb 04
3
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
APPLICATION INFORMATION
RF performance in a common source class-AB circuit. VDS = 27 V; f = 890 MHz; Th = 25 °C; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Mode of operation: 2-tone CW, 100 kHz spacing, IDQ = 700 mA
16
17 (1)
−
dB
drain efficiency
35
38
−
%
IRL
input return loss
−
−9
<−6
dB
d3
third order intermodulation
distortion
−
−33
−27
dBc
Gp
power gain
ηD
PL = 100 W (PEP)
ruggedness
VSWR = 10 : 1 through all
phases; PL = 125 W (PEP)
no degradation in output power
Mode of operation: CDMA, IS95 (pilot, paging, sync and traffic codes 8 to 13), IDQ = 575 mA
Gp
power gain
PL = 24 W (AV)
−
15
−
dB
ηD
drain efficiency
PL = 24 W (AV)
−
27
−
%
ACPR 750
adjacent channel power ratio
at BW = 30 kHz
−
−45
−
dBc
Note
1. Refer to RF Gain grouping table.
RF Gain grouping
GAIN(2)
(dB)
CODE(1)
MAX.
B
16.0
16.5
C
16.5
17.0
D
17.0
17.5
E
17.5
18.0
Notes
1. 0.2 dB overlap is allowed for measurement repeatability.
2. For 2-tone at f1 = 890 MHz; f2 = 890.1 MHz.
2004 Feb 04
MIN.
4
Philips Semiconductors
Product specification
Base station LDMOS transistors
MLE343
22
handbook, halfpage
BLF900-110; BLF900S-110
handbook, halfpage
ηD
(%)
Gp
(dB)
18
MLE344
18
Gp
60
(dB)
17
50
ηD
(%)
Gp
40
40
Gp
16
30
ηD
14
15
20
14
10
20
ηD
10
1
10
102
Pout (W)
13
0
103
0
80
40
0
120
PL(PEP) (W)
VDS = 27 V; IDQ = 700 mA; f = 890 MHz.
VDS = 27 V; IDQ = 700 mA; f1 = 890.0 MHz; f2 = 890.1 MHz.
Fig.3
Fig.4
Power gain and efficiency as functions of
load power; typical values.
MLE345
0
Power gain and efficiency as functions of
peak envelope load power; typical values.
MLE346
0
handbook, halfpage
handbook, halfpage
dim
(dBc)
dim
(dBc)
−20
−20
−40
(1)
(2)
−40
(1)
−60
(3)
(2)
(3)
−60
10
1
102
−80
103
1
10
PL(PEP) (W)
VDS = 27 V; f1 = 890.0 MHz; f2 = 890.1 MHz.
(1) IDQ = 600 mA.
Fig.5
(2) IDQ = 800 mA.
103
PL(PEP) (W)
VDS = 27 V; IDQ = 700 mA; f1 = 890.0 MHz; f2 = 890.1 MHz.
(3) IDQ = 700 mA.
(1) d3.
Third order intermodulation distortion as a
function of peak envelope load power;
typical values.
2004 Feb 04
102
Fig.6
5
(2) d5.
(3) d7.
Third order intermodulation distortion as a
function of peak envelope load power;
typical values.
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
MLE348
1.5
handbook, halfpage
ri
ZI
(Ω)
ZL
(Ω)
0.5
2.5
−0.5
2
−1.5
XL
0.88
0.87
0.89
f (GHz)
1
0.86
0.9
Input impedance as a function of frequency
(series components); typical values.
mle347
Gp 40
(dB)
0.87
0.88
0.89
f (GHz)
0.9
Class-AB operation; VDS = 27 V; IDQ = 700 mA; PL = 100 W.
Values comprised for different parameters.
Class-AB operation; VDS = 27 V; IDQ = 700 mA; PL = 100 W.
Values comprised for different parameters.
Fig.7
RI
1.5
xi
−2.5
0.86
MLE349
3
handbook, halfpage
Fig.8
Input impedance as a function of frequency
(series components); typical values.
−40
ACPR
(dB)
ηD
(%)
−50
30
ADJ
ηD
20
−60
Gp
drain
handbook, halfpage
ALT
10
−70
ZL
gate
0
24
32
40
Pout (dBm)
48
Z IN
−80
MGS998
VDS = 27 V;IDQ = 575 mA; f = 881.5 MHz.
Test signal: Single carrier IS-97 CDMA with PAR = 9.5 dB at 0.01 %
(pilot, paging, sync, 6 traffic channels with Walsh codes 8-13).
ADJ at 750 kHz offset in 30 kHz BW;
ALT at 1.98 MHz offset in 30 kHz BW.
Fig.9
Single carrier CDMA performance as a
function of output power.
2004 Feb 04
Fig.10 Definition of transistor impedance.
6
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R1
L4
R2 L1
C8
R3
C13
Vdd
Philips Semiconductors
Base station LDMOS transistors
2004 Feb 04
C19
C18
C9
C3
C10
C4
7
L5
C1
L6
L7
C12
D.U.T.
C2
L2
L3
L 11
L8
L9
C17
L 12
L 10
RF in
RF out
C6
C5
C11
C14 C15
mle351
Product specification
Fig.11 Test circuit for 860 to 900 MHz operation.
C16
BLF900-110; BLF900S-110
C7
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
58.5
58.5
L3
71
PHILIPS
PHILIPS
900 MHz Input
Rev. 1
900 MHz Output
Rev. 1
C19
_
R1
R2
L4
R3
C18
C8
+V9
L6
L2
L7
Vdd
+
C13
C12
C10
C4
C3
C2
L5
C9
L1
L3
L9
L8
L10
C15
L11
L12
C17
C1
C14
C6
C7 C5
C16
C11
PHILIPS
PHILIPS
900 MHz Input
Rev. 1
900 MHz Output
Rev. 1
mle350
Dimensions in mm.
The components are situated on one side of the copper-clad Ultralam 2000 printed-circuit board (εr = 2.5); thickness = 31 mm.
The other side is unetched and serves as a ground plane.
Fig.12 Component layout for 860 to 900 MHz test circuit.
2004 Feb 04
8
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
List of components (see Figs 11 and 12)
COMPONENT
DESCRIPTION
VALUE
DIMENSIONS
C1
multilayer ceramic chip capacitor; note 1
30 pF
C2, C12
multilayer ceramic chip capacitor; note 1
47 pF
C3, C13
multilayer ceramic chip capacitor; note 1
300 pF
C4
multilayer ceramic chip capacitor; note 1
10 pF
C5
multilayer ceramic chip capacitor; note 1
3 pF
C6, C7, C15
trimmer capacitors (Tekelec); note 2
0.8 to 8 pF
C8
multilayer ceramic chip capacitor; note 1
20 nF
C9
tantalum capacitor
10 µF; 35 V
C10, C11
multilayer ceramic chip capacitor; note 1
13 pF
C14
multilayer ceramic chip capacitor; note 1
8.2 pF
C16
trimmer capacitor
0.5 to 4.5 pF
C17
multilayer ceramic chip capacitor; note 1
56 pF
C18
tantalum capacitor; low ESR
10 µF; 35 V
C19
electrolytic capacitor
220 µF; 40 V
L1
ferrite bead (long)
grade 4S2
L2
3 turn ind. copper wire
1 mm; int dia = 4.5 mm
L3
4 turn ind. copper wire
1 mm; int dia = 3 mm
L4
ferrite bead (short)
grade 4S2
L5
stripline; note 3
Z0 = 50 Ω
2 x 17.2 mm
L6
stripline; note 3
Z0 = 50 Ω
2 x 25.4 mm
L7
stripline; note 3
Z0 = 50 Ω
5.6 x 17.4 mm
L8
stripline; note 3
Z0 = 50 Ω
16 x 10.2 mm
L9
stripline; note 3
Z0 = 10 Ω
16 x 10.2 mm
L10
stripline; note 3
Z0 = 25 Ω
5.6 x 17.4 mm
L11
stripline; note 3
Z0 = 50 Ω
2 x 25.4 mm
L12
stripline; note 3
Z0 = 50 Ω
2 x 17.2 mm
R1
SMD resistor
8.2 Ω, 0.1 W
R2
SMD resistor
4.7 Ω, 0.1 W
R3
metal film resistor
10 Ω, 0.6 W
Notes
1. American Technical Ceramics type 100A or capacitor of same quality.
2. Mounted flat.
3. Striplines are on a double copper-clad Ultralam 2000 printed-circuit board (εr = 2.5); thickness = 0.31 mm.
2004 Feb 04
9
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
PACKAGE OUTLINES
Flanged LDMOST ceramic package; 2 mounting holes; 2 leads
SOT502A
D
A
F
3
D1
U1
B
q
c
C
1
H
L
E1
p
U2
E
w1 M A M B M
A
2
w2 M C M
b
0
5
Q
10 mm
scale
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
A
b
c
mm
4.72
3.43
12.83
12.57
0.15
0.08
inches
0.186
0.135
0.505 0.006
0.495 0.003
OUTLINE
VERSION
E
E1
F
H
L
p
Q
q
U1
U2
w1
w2
20.02 19.96
19.61 19.66
9.50
9.30
9.53
9.25
1.14
0.89
19.94
18.92
5.33
4.32
3.38
3.12
1.70
1.45
27.94
34.16
33.91
9.91
9.65
0.25
0.51
0.788 0.786
0.772 0.774
0.374 0.375
0.366 0.364
0.067
1.100
0.057
1.345
1.335
0.390
0.380
0.01
0.02
D
D1
0.045 0.785
0.035 0.745
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-28
03-01-10
SOT502A
2004 Feb 04
0.210 0.133
0.170 0.123
10
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
Earless flanged LDMOST ceramic package; 2 leads
SOT502B
D
A
F
3
D
D1
c
U1
1
L
H
E1
U2
E
2
w2 M D M
b
0
5
Q
10 mm
scale
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
A
b
c
mm
4.72
3.43
12.83
12.57
0.15
0.08
inches
0.186
0.135
0.505 0.006
0.495 0.003
OUTLINE
VERSION
E
E1
F
H
L
Q
U1
U2
w2
20.02 19.96
19.61 19.66
9.50
9.30
9.53
9.25
1.14
0.89
19.94
18.92
5.33
4.32
1.70
1.45
20.70
20.45
9.91
9.65
0.25
0.788 0.786
0.772 0.774
0.374 0.375
0.366 0.364
0.045 0.785
0.035 0.745
0.210
0.170
0.067 0.815
0.057 0.805
D
D1
REFERENCES
IEC
JEDEC
JEITA
EUROPEAN
PROJECTION
ISSUE DATE
99-12-28
03-01-10
SOT502B
2004 Feb 04
0.390
0.010
0.380
11
Philips Semiconductors
Product specification
Base station LDMOS transistors
BLF900-110; BLF900S-110
DATA SHEET STATUS
LEVEL
DATA SHEET
STATUS(1)
PRODUCT
STATUS(2)(3)
Development
DEFINITION
I
Objective data
II
Preliminary data Qualification
This data sheet contains data from the preliminary specification.
Supplementary data will be published at a later date. Philips
Semiconductors reserves the right to change the specification without
notice, in order to improve the design and supply the best possible
product.
III
Product data
This data sheet contains data from the product specification. Philips
Semiconductors reserves the right to make changes at any time in order
to improve the design, manufacturing and supply. Relevant changes will
be communicated via a Customer Product/Process Change Notification
(CPCN).
Production
This data sheet contains data from the objective specification for product
development. Philips Semiconductors reserves the right to change the
specification in any manner without notice.
Notes
1. Please consult the most recently issued data sheet before initiating or completing a design.
2. The product status of the device(s) described in this data sheet may have changed since this data sheet was
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.
3. For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.
DEFINITIONS
DISCLAIMERS
Short-form specification  The data in a short-form
specification is extracted from a full data sheet with the
same type number and title. For detailed information see
the relevant data sheet or data handbook.
Life support applications  These products are not
designed for use in life support appliances, devices, or
systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips
Semiconductors customers using or selling these products
for use in such applications do so at their own risk and
agree to fully indemnify Philips Semiconductors for any
damages resulting from such application.
Limiting values definition  Limiting values given are in
accordance with the Absolute Maximum Rating System
(IEC 60134). Stress above one or more of the limiting
values may cause permanent damage to the device.
These are stress ratings only and operation of the device
at these or at any other conditions above those given in the
Characteristics sections of the specification is not implied.
Exposure to limiting values for extended periods may
affect device reliability.
Right to make changes  Philips Semiconductors
reserves the right to make changes in the products including circuits, standard cells, and/or software described or contained herein in order to improve design
and/or performance. When the product is in full production
(status ‘Production’), relevant changes will be
communicated via a Customer Product/Process Change
Notification (CPCN). Philips Semiconductors assumes no
responsibility or liability for the use of any of these
products, conveys no licence or title under any patent,
copyright, or mask work right to these products, and
makes no representations or warranties that these
products are free from patent, copyright, or mask work
right infringement, unless otherwise specified
Application information  Applications that are
described herein for any of these products are for
illustrative purposes only. Philips Semiconductors make
no representation or warranty that such applications will be
suitable for the specified use without further testing or
modification.
2004 Feb 04
12
Philips Semiconductors – a worldwide company
Contact information
For additional information please visit http://www.semiconductors.philips.com.
Fax: +31 40 27 24825
For sales offices addresses send e-mail to: [email protected].
SCA76
© Koninklijke Philips Electronics N.V. 2004
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Printed in The Netherlands
R77/02/pp13
Date of release: 2004
Feb 04
Document order number:
9397 750 12171