PHILIPS TDA1312AT

INTEGRATED CIRCUITS
DATA SHEET
TDA1312A; TDA1312AT
Stereo continuous calibration
DAC (CC-DAC)
Preliminary specification
File under Integrated Circuits, IC01
July 1993
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
FEATURES
GENERAL DESCRIPTION
• 8 × oversampling (simultaneous input) possible
The TDA1312A; 1312AT is a voltage driven D/A converter
and is a device of a new generation of digital-to-analog
converters which embodies the innovative technique of
Continuous Calibration (CC). The largest bit-currents are
repeatedly generated by one single current reference
source. This duplication is based upon an internal charge
storage principle having an accuracy insensitive to ageing,
temperature matching and process variations.
• Voltage output
• Space saving package SO8 or DIL8
• Low power consumption
• Wide dynamic range (16-bit resolution)
• Continuous Calibration (CC) concept
• Easy application:
The TDA1312A; 1312AT is fabricated in a 1.0 µm CMOS
process and features an extremely low power dissipation,
small package size and easy application. Furthermore, the
accuracy of the intrinsic high coarse-current combined
with the implemented symmetrical offset decoding method
preclude zero-crossing distortion and ensures high quality
audio reproduction. Therefore, the CC-DAC is eminently
suitable for use in (portable) digital audio equipment.
– single 4 to 5.5 V rail supply
– output current and bias current are proportional to the
supply voltage
– integrated current-to-voltage converter
• Internal bias current ensures maximum dynamic range
• Wide operating temperature range (−40 °C to + 85 °C)
• Compatible with most current Japanese input formats:
time multiplexed, two's complement and TTL
• No zero-crossing distortion
• Cost efficient.
ORDERING INFORMATION
PACKAGE
EXTENDED TYPE NUMBER
PINS
PIN POSITION
MATERIAL
CODE
TDA1312A(1)
8
DIL
plastic
SOT97DE
TDA1312AT(2)
8
SO8
plastic
SOT96AG
Notes
1. SOT97-1; 1996 August 14.
2. SOT96-1; 1996 August 14.
July 1993
2
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
QUICK REFERENCE DATA
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
VDD
supply voltage
4
5
5.5
V
IDD
supply current
VDD = 5 V; at code 0000H
−
3.4
6.0
mA
VFS
full scale output voltage
VDD = 5 V
1.8
2.0
2.2
V
(THD+N)/S
total harmonic distortion plus at 0 dB signal level
noise
−
−68
−63
dB
−
0.04
0.07
%
−
−30
−24
dB
−
3
6
%
at −60 dB signal level;
A-weighted
−
−33
−
dB
−
2
−
%
A-weighted; at code 0000H
86
92
−
dB
at −60 dB signal level
S/N
signal-to-noise ratio at
bipolar zero
tCS
current settling time to ±1
LSB
−
0.2
−
µs
BR
input bit rate at data input
−
−
18.4
Mbits/s
fBCK
clock frequency at clock
input
−
−
18.4
MHz
TCFS
full scale temperature
coefficient at analog
outputs (IOL; IOR)
−
±400
−
ppm
Tamb
operating ambient
temperature
−40
−
+85
°C
Ptot
total power dissipation
−
17
30
mW
July 1993
VDD = 5 V; at code 0000H
3
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6
RIGHT INPUT REGISTER
LEFT OUTPUT REGISTER
RIGHT OUTPUT REGISTER
LEFT BIT SWITCHES
RIGHT BIT SWITCHES
7
I/V
I/V
IOL
IOR
11-BIT
PASSIVE
DIVIDER
4
BCK
DATAR
DATAL
32 (5-BIT)
CALIBRATED
CURRENT
SOURCES
1 CALIBRATED
SPARE SOURCE
1 CALIBRATED
SPARE SOURCE
3
8
11-BIT
PASSIVE
DIVIDER
REFERENCE
SOURCE
CONTROL
AND
TIMING
TDA1312A
TDA1312AT
5
VDD
4
C2
GND
MGE225
Preliminary specification
Fig.1 Block diagram.
100 nF
TDA1312A; TDA1312AT
WS
32 (5-BIT)
CALIBRATED
CURRENT
SOURCES
1
2
VOR
Philips Semiconductors
VOL
LEFT INPUT REGISTER
Stereo continuous calibration
DAC (CC-DAC)
July 1993
handbook, full pagewidth
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
PINNING
SYMBOL
PIN
DESCRIPTION
BCK
1
bit clock input
DATAR
2
right data input
DATAL
3
GND
handbook, halfpage
BCK
1
8
WS
left data input
DATAR
2
7
VOR
4
ground
DATAL
VDD
5
positive supply voltage
VOL
6
left channel output
VOR
7
right channel output
WS
8
word select input
GND
VOL
4
VDD
5
MGE224
Fig.2 Pin configuration.
connected to an 11-bit binary current divider consisting of
2048 transistors. A symmetrical offset decoding principle
is incorporated and arranges the bit switching in such a
way that the zero-crossing is performed only by switching
the LSB currents.
FUNCTIONAL DESCRIPTION
The basic operation of the continuous calibration DAC is
illustrated in Fig.3. The figure shows the calibration and
operation cycle. During calibration of the MOS current
source (Fig.3a) transistor M1 is connected as a diode by
applying a reference current. The voltage Vgs on the
intrinsic gate-source capacitance Cgs of M1 is then
determined by the transistor characteristics. After
calibration of the drain current to the reference value Iref,
the switch S1 is opened and S2 is switched to the other
position (Fig.3b). The gate-to-source voltage Vgs of M1 is
not changed because the charge on Cgs is preserved.
Therefore, the drain current of M1 will still be equal to IREF
and this exact duplicate of IREF is now available at the OUT
terminal.
The TDA1312A; AT (CC-DAC) accepts serial input data
formats of 16-bit word length. Left and right data words are
time multiplexed. The most significant bit (bit 1) must
always be first. The input data format is shown in Figs.4
and 5.
Data is placed in the right and left input registers (see
Fig.1). The data in the input registers is simultaneously
latched in the output registers which control the bit
switches.
An internal offset voltage VOFF is added to the full scale
output voltage VFS; VOFF and VFS are proportional to VDD:
Where VDD1/VDD2 = VFS1/VFS2 = VOFF1/VOFF2.
The 32 current sources and the spare current source of the
TDA1312A; AT are continuously calibrated (see Fig.1).
The spare current source is included to allow continuous
converter operation. The output of one calibrated source is
July 1993
TDA1312
3 TDA1312AT 6
5
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
OUT
handbook, halfpage
OUT
IREF
IREF
IREF
S2
S2
S1
S1
+
Cgs
M1
+
Cgs
Vgs
(a)
M1
Vgs
(b)
MGE226
Fig.3 Calibration principle; (a) calibration (b) operation.
LIMITING VALUES
In accordance with the Absolute Maximum Rating System (IEC 134).
SYMBOL
PARAMETER
CONDITIONS
MIN.
MAX.
UNIT
VDD
supply voltage
−
6.0
Tstg
storage temperature
−55
+150
°C
TXTAL
maximum crystal temperature
−
+150
°C
Tamb
operating ambient temperature
−40
+85
°C
Ves
electrostatic handling
note 1
−2000
+2000
V
note 2
−200
+200
V
V
Notes
1. Human body model: C = 100 pF; R = 1500 Ω; 3 zaps positive and negative.
2. Machine model: C = 200 pF; L = 0.5 µH; R = 10 Ω; 3 zaps positive and negative.
THERMAL RESISTANCE
SYMBOL
Rth j-a
July 1993
PARAMETER
THERMAL RESISTANCE
from junction to ambient in free air
DIL8
100 K/W
SO8
210 K/W
6
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
CHARACTERISTICS
VDD = 5 V; Tamb = 25 °C; measured in Fig.1; unless otherwise specified.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Supply
VDD
positive supply voltage
IDD
supply current
4.0
5.0
5.5
V
at code 0000H
−
3.4
6.0
mA
Digital inputs; pins WS, BCK and DATA
IIL
input leakage current LOW
VI = 0 V
−
−
10
µA
IIH
input leakage current HIGH
VI = 5 V
−
−
10
µA
fBCK
clock frequency
−
−
18.4
MHz
BR
bit rate data input
−
−
18.4
Mbits/s
fWS
word select input frequency
−
−
384
kHz
Timing (see Fig.4)
tr
rise time
−
−
12
ns
tf
fall time
−
−
12
ns
tCY
bit clock cycle time
54
−
−
ns
tBCKH
bit clock pulse width HIGH
15
−
−
ns
tBCKL
bit clock pulse width LOW
15
−
−
ns
tSU;DAT
data set-up time
12
−
−
ns
tHD:DAT
data hold time to bit clock
2
−
−
ns
tHD:WS
word select hold time
2
−
−
ns
tSU;WS
word select set-up time
12
−
−
ns
Analog outputs; pins VOL and VOR
VFS
full-scale voltage
1.8
2.0
2.2
V
TCFS
full-scale temperature coefficient
−
±400
−
ppm
VOFF
offset voltage
at code 1000H
0.42
0.47
0.52
V
(THD+N)/S
total harmonic distortion plus noise
at 0 dB signal level;
note 1
−
−68
−63
dB
−
0.04
0.07
%
at −60 dB signal level; −
note 1
−
−30
−24
dB
3
6
%
at −60 dB signal level; −
A-weighted; note1
−
−33
−
dB
2
−
%
−
−65
−61
dB
−
0.05
0.09
%
at 0 dB signal level;
f = 20 Hz to 20 kHz
July 1993
7
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
SYMBOL
TDA1312A; TDA1312AT
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Analog outputs; pins VOL and VOR
current settling time to ±1 LSB
tcs
−
α
channel separation
δIO
unbalance between outputs
td
time delay between outputs
S/N
signal-to-noise ratio at bipolar zero
note 1
A-weighted;
at code 0000H
0.2
−
µs
75
80
−
dB
−
0.2
0.3
dB
−
±0.2
−
µs
86
92
−
dB
Note
1. Measured with 1 kHz sinewave generated at sampling rate of 192 kHz.
LEFT
handbook, full pagewidth
WS
RIGHT
tr
<12
tBCKH
>15
tf
<12
tHD; WS
>2
tBCKL
>15
>12
tSU; WS
BCK
tCY
>54
DATAR
DATAL
tSU; DAT
>12
tHD; DAT
>2
MSB
LSB
MGE227
SAMPLE OUT
Fig.4 Input signals timing.
July 1993
8
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Philips Semiconductors
Stereo continuous calibration
DAC (CC-DAC)
handbook, full pagewidth
July 1993
DATAR
DATAL
LSB
MSB
BCK
9
WS
MGE228
SAMPLE OUT
Preliminary specification
TDA1312A; TDA1312AT
Fig.5 Input signals format.
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
PACKAGE OUTLINES
DIP8: plastic dual in-line package; 8 leads (300 mil)
SOT97-1
ME
seating plane
D
A2
A
A1
L
c
Z
w M
b1
e
(e 1)
b
MH
b2
5
8
pin 1 index
E
1
4
0
5
10 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
min.
A2
max.
b
b1
b2
c
D (1)
E (1)
e
e1
L
ME
MH
w
Z (1)
max.
mm
4.2
0.51
3.2
1.73
1.14
0.53
0.38
1.07
0.89
0.36
0.23
9.8
9.2
6.48
6.20
2.54
7.62
3.60
3.05
8.25
7.80
10.0
8.3
0.254
1.15
inches
0.17
0.020
0.13
0.068
0.045
0.021
0.015
0.042
0.035
0.014
0.009
0.39
0.36
0.26
0.24
0.10
0.30
0.14
0.12
0.32
0.31
0.39
0.33
0.01
0.045
Note
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT97-1
050G01
MO-001AN
July 1993
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
92-11-17
95-02-04
10
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
SO8: plastic small outline package; 8 leads; body width 3.9 mm
SOT96-1
D
E
A
X
c
y
HE
v M A
Z
5
8
Q
A2
A
(A 3)
A1
pin 1 index
θ
Lp
L
4
1
e
detail X
w M
bp
0
2.5
5 mm
scale
DIMENSIONS (inch dimensions are derived from the original mm dimensions)
UNIT
A
max.
A1
A2
A3
bp
c
D (1)
E (2)
e
HE
L
Lp
Q
v
w
y
Z (1)
mm
1.75
0.25
0.10
1.45
1.25
0.25
0.49
0.36
0.25
0.19
5.0
4.8
4.0
3.8
1.27
6.2
5.8
1.05
1.0
0.4
0.7
0.6
0.25
0.25
0.1
0.7
0.3
0.01
0.019 0.0100
0.014 0.0075
0.20
0.19
0.16
0.15
0.244
0.039 0.028
0.050
0.041
0.228
0.016 0.024
inches
0.010 0.057
0.069
0.004 0.049
0.01
0.01
0.028
0.004
0.012
θ
Notes
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.
REFERENCES
OUTLINE
VERSION
IEC
JEDEC
SOT96-1
076E03S
MS-012AA
July 1993
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
95-02-04
97-05-22
11
o
8
0o
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
Several techniques exist for reflowing; for example,
thermal conduction by heated belt. Dwell times vary
between 50 and 300 seconds depending on heating
method. Typical reflow temperatures range from
215 to 250 °C.
SOLDERING
Introduction
There is no soldering method that is ideal for all IC
packages. Wave soldering is often preferred when
through-hole and surface mounted components are mixed
on one printed-circuit board. However, wave soldering is
not always suitable for surface mounted ICs, or for
printed-circuits with high population densities. In these
situations reflow soldering is often used.
Preheating is necessary to dry the paste and evaporate
the binding agent. Preheating duration: 45 minutes at
45 °C.
WAVE SOLDERING
This text gives a very brief insight to a complex technology.
A more in-depth account of soldering ICs can be found in
our “IC Package Databook” (order code 9398 652 90011).
Wave soldering techniques can be used for all SO
packages if the following conditions are observed:
• A double-wave (a turbulent wave with high upward
pressure followed by a smooth laminar wave) soldering
technique should be used.
DIP
SOLDERING BY DIPPING OR BY WAVE
• The longitudinal axis of the package footprint must be
parallel to the solder flow.
The maximum permissible temperature of the solder is
260 °C; solder at this temperature must not be in contact
with the joint for more than 5 seconds. The total contact
time of successive solder waves must not exceed
5 seconds.
• The package footprint must incorporate solder thieves at
the downstream end.
During placement and before soldering, the package must
be fixed with a droplet of adhesive. The adhesive can be
applied by screen printing, pin transfer or syringe
dispensing. The package can be soldered after the
adhesive is cured.
The device may be mounted up to the seating plane, but
the temperature of the plastic body must not exceed the
specified maximum storage temperature (Tstg max). If the
printed-circuit board has been pre-heated, forced cooling
may be necessary immediately after soldering to keep the
temperature within the permissible limit.
Maximum permissible solder temperature is 260 °C, and
maximum duration of package immersion in solder is
10 seconds, if cooled to less than 150 °C within
6 seconds. Typical dwell time is 4 seconds at 250 °C.
REPAIRING SOLDERED JOINTS
A mildly-activated flux will eliminate the need for removal
of corrosive residues in most applications.
Apply a low voltage soldering iron (less than 24 V) to the
lead(s) of the package, below the seating plane or not
more than 2 mm above it. If the temperature of the
soldering iron bit is less than 300 °C it may remain in
contact for up to 10 seconds. If the bit temperature is
between 300 and 400 °C, contact may be up to 5 seconds.
REPAIRING SOLDERED JOINTS
Fix the component by first soldering two diagonallyopposite end leads. Use only a low voltage soldering iron
(less than 24 V) applied to the flat part of the lead. Contact
time must be limited to 10 seconds at up to 300 °C. When
using a dedicated tool, all other leads can be soldered in
one operation within 2 to 5 seconds between
270 and 320 °C.
SO
REFLOW SOLDERING
Reflow soldering techniques are suitable for all SO
packages.
Reflow soldering requires solder paste (a suspension of
fine solder particles, flux and binding agent) to be applied
to the printed-circuit board by screen printing, stencilling or
pressure-syringe dispensing before package placement.
July 1993
12
Philips Semiconductors
Preliminary specification
Stereo continuous calibration
DAC (CC-DAC)
TDA1312A; TDA1312AT
DEFINITIONS
Data sheet status
Objective specification
This data sheet contains target or goal specifications for product development.
Preliminary specification
This data sheet contains preliminary data; supplementary data may be published later.
Product specification
This data sheet contains final product specifications.
Limiting values
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation
of the device at these or at any other conditions above those given in the Characteristics sections of the specification
is not implied. Exposure to limiting values for extended periods may affect device reliability.
Application information
Where application information is given, it is advisory and does not form part of the specification.
LIFE SUPPORT APPLICATIONS
These products are not designed for use in life support appliances, devices, or systems where malfunction of these
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such
improper use or sale.
July 1993
13