PHILIPS BLF178XR112

BLF178XR; BLF178XRS
Power LDMOS transistor
Rev. 4 — 12 July 2013
Product data sheet
1. Product profile
1.1 General description
A 1400 W extremely rugged LDMOS power transistor for broadcast and industrial
applications in the HF to 128 MHz band.
Table 1.
Application information
Test signal
f
VDS
PL
Gp
D
(MHz)
(V)
(W)
(dB)
(%)
CW
108
50
1200
23
80
pulsed RF
108
50
1400
28
72
1.2 Features and benefits
 Typical pulsed performance at frequency of 108 MHz, a supply voltage of 50 V and an
IDq of 40 mA, a tp of 100 s with  of 20 %:
 Output power = 1400 W
 Power gain = 28 dB
 Efficiency = 72 %
 Easy power control
 Integrated ESD protection
 Excellent ruggedness
 High efficiency
 Excellent thermal stability
 Designed for broadband operation (HF to 128 MHz)
 Compliant to Directive 2002/95/EC, regarding Restriction of Hazardous Substances
(RoHS)
1.3 Applications
 Industrial, scientific and medical applications
 Broadcast transmitter applications
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
2. Pinning information
Table 2.
Pinning
Pin
Description
Simplified outline
Graphic symbol
BLF178XR (SOT539A)
1
drain1
2
drain2
3
gate1
4
gate2
5
1
2
1
5
3
3
4
5
4
[1]
source
2
sym117
BLF178XRS (SOT539B)
1
drain1
2
drain2
3
gate1
4
gate2
5
source
1
2
1
5
3
3
4
5
4
[1]
2
sym117
[1]
Connected to flange.
3. Ordering information
Table 3.
Ordering information
Type number
Package
Name
Description
Version
BLF178XR
-
flanged balanced LDMOST ceramic package;
2 mounting holes; 4 leads
SOT539A
BLF178XRS
-
earless flanged balanced LDMOST ceramic package;
4 leads
SOT539B
4. Limiting values
Table 4.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
BLF178XR_BLF178XRS
Product data sheet
Symbol
Parameter
Conditions
Min
Max
Unit
VDS
drain-source voltage
-
110
V
VGS
gate-source voltage
6
+11
V
Tstg
storage temperature
65
+150
C
Tj
junction temperature
-
200
C
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
2 of 14
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
5. Thermal characteristics
Table 5.
Thermal characteristics
Symbol Parameter
Conditions
Tj = 150 C
[1][2]
Rth(j-c)
thermal resistance from junction to case
Zth(j-c)
transient thermal impedance from junction Tj = 150 C; tp = 100 s;
to case
 = 20 %
[1]
Tj is the junction temperature.
[2]
Rth(j-c) is measured under RF conditions.
[3]
See Figure 1.
[3]
Typ
Unit
0.11
K/W
0.033 K/W
DDD
=WKMF
M .:
WSV
(1)  = 1 %
(2)  = 2 %
(3)  = 5 %
(4)  = 10 %
(5)  = 20 %
(6)  = 50 %
(7)  = 100 % (DC)
Fig 1.
BLF178XR_BLF178XRS
Product data sheet
Transient thermal impedance from junction to case as a function of pulse
duration
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BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
6. Characteristics
Table 6.
DC characteristics
Tj = 25 C; per section unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max
Unit
V(BR)DSS drain-source breakdown
voltage
VGS = 0 V; ID = 5.5 mA
110
-
-
V
VGS(th)
gate-source threshold voltage
VDS = 10 V; ID = 550 mA
1.25
1.7
2.25
V
VGSq
gate-source quiescent voltage
VDS = 50 V; ID = 20 mA
0.8
1.3
1.8
V
IDSS
drain leakage current
VGS = 0 V; VDS = 50 V
-
-
2.8
A
IDSX
drain cut-off current
VGS = VGS(th) + 3.75 V;
VDS = 10 V
-
77
-
A
IGSS
gate leakage current
VGS = 11 V; VDS = 0 V
-
-
280
nA
RDS(on)
drain-source on-state
resistance
VGS = VGS(th) + 3.75 V;
ID = 19.25 A
-
0.07
-

Table 7.
AC characteristics
Tj = 25 C; per section unless otherwise specified.
Symbol Parameter
Conditions
Min Typ Max Unit
Crs
feedback capacitance
VGS = 0 V; VDS = 50 V; f = 1 MHz
-
5.5
-
pF
Ciss
input capacitance
VGS = 0 V; VDS = 50 V; f = 1 MHz
-
414 -
pF
Coss
output capacitance
VGS = 0 V; VDS = 50 V; f = 1 MHz
-
184 -
pF
Table 8.
RF characteristics
Test signal: pulsed RF; tp = 100 s;  = 20 %; f = 108 MHz; RF performance at VDS = 50 V;
IDq = 40 mA; Tcase = 25 C; unless otherwise specified; in a class-AB production test circuit.
BLF178XR_BLF178XRS
Product data sheet
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Gp
power gain
PL = 1400 W
27
28
-
dB
RLin
input return loss
PL = 1400 W
-
15
11
dB
D
drain efficiency
PL = 1400 W
68
72
-
%
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4 of 14
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
DDD
&RVV
S)
9'69
VGS = 0 V; f = 1 MHz.
Fig 2.
Output capacitance as a function of drain-source voltage; typical values per
section
7. Test information
7.1 Ruggedness in class-AB operation
The BLF178XR and BLF178XRS are capable of withstanding a load mismatch
corresponding to VSWR > 65 : 1 through all phases under the following conditions:
VDS = 50 V; IDq = 40 mA; PL = 1400 W pulsed; f = 108 MHz.
7.2 Impedance information
drain 1
gate 1
Zi
ZL
gate 2
drain 2
001aan207
Fig 3.
Definition of transistor impedance
Table 9.
Typical push-pull impedance
Simulated Zi and ZL device impedance; impedance info at VDS = 50 V and PL = 1400 W.
BLF178XR_BLF178XRS
Product data sheet
f
Zi
ZL
(MHz)
()
()
108
2.35  j6.06
2.78 + j0.48
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
5 of 14
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
7.3 Test circuit
7
&
&
9JV
5
&
/
&
&
&
&
/
&
&
/
&
&
9GV
/
&
&
/
&
5
/
9JV
&
/
&
/
&
&
&
&
9GV
&
7
PP
DDD
PP
PP
PP
Printed-Circuit Board (PCB): RF 35; r = 3.5; thickness = 0.765 mm; thickness copper plating = 35 m.
See Table 10 for a list of components.
Fig 4.
Component layout for class-AB production test circuit
Table 10. List of components
For test circuit see Figure 4.
Component
Product data sheet
Value
Remarks
C1, C2, C5, C6, C14,
C15, C21, C22
multilayer ceramic chip capacitor
1 nF
[1]
C3
multilayer ceramic chip capacitor
82 pF
[1]
C4
multilayer ceramic chip capacitor
240 pF
[1]
C7, C8
multilayer ceramic chip capacitor
4.7 F; 50 V
C10, C11
electrolytic capacitor
2200 F; 63 V
C12, C13
multilayer ceramic chip capacitor
4.7 F; 100 V
C16, C17
multilayer ceramic chip capacitor
120 pF
[1]
C18
multilayer ceramic chip capacitor
82 pF
[1]
C19
multilayer ceramic chip capacitor
110 pF
[1]
C20
multilayer ceramic chip capacitor
56 pF
[1]
L1, L2, L3, L4
1.5 turn 0.8 mm copper wire
D = 3 mm;
length = 2 mm
L5, L6
5 turn 0.8 mm copper wire
D = 3 mm;
length = 4.5 mm
L7, L8
2.5 turn 0.8 mm copper wire
D = 3 mm;
length = 3 mm
R3, R4
SMD resistor
9.1 
1206
T1
semi rigid coax
25 ; 160 mm
UT-090C-25
T2
semi rigid coax
25 ; 160 mm
UT-141C-25
[1]
BLF178XR_BLF178XRS
Description
American Technical Ceramics type 800B or capacitor of same quality.
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Rev. 4 — 12 July 2013
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BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
7.4 Graphical data
The following figures are measured in a class-AB production test circuit.
7.4.1 1-Tone CW pulsed
DDD
Ș'
DDD
*S
G%
3/
G%P
*S
Ș'
OGHDO3/
3/
3/:
3LG%P
VDS = 50 V; IDq = 40 mA; f = 108 MHz; tp = 100 s;
 = 20 %.
VDS = 50 V; IDq = 40 mA; f = 108 MHz; tp = 100 s;
 = 20 %.
(1) PL(1dB) = 61.3 dBm (1350 W)
(2) PL(3dB) = 61.9 dBm (1550 W)
Fig 5.
Power gain and drain efficiency as function of
output power; typical values
BLF178XR_BLF178XRS
Product data sheet
Fig 6.
Output power as a function of input power;
typical values
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
7 of 14
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
DDD
DDD
*S
G%
Ș'
3/:
VDS = 50 V; f = 108 MHz; tp = 100 s;  = 20 %.
(1) IDq = 20 mA
(2) IDq = 40 mA
(2) IDq = 40 mA
(3) IDq = 80 mA
(3) IDq = 80 mA
(4) IDq = 160 mA
(4) IDq = 160 mA
Power gain as a function of output power;
typical values
Fig 8.
DDD
3/:
Drain efficiency as a function of output power;
typical values
DDD
*S
G%
VDS = 50 V; f = 108 MHz; tp = 100 s;  = 20 %.
(1) IDq = 20 mA
Fig 7.
Ș'
3/:
IDq = 40 mA; f = 108 MHz; tp = 100 s;  = 20 %.
(1) VDS = 20 V
(2) VDS = 25 V
(2) VDS = 25 V
(3) VDS = 30 V
(3) VDS = 30 V
(4) VDS = 35 V
(4) VDS = 35 V
(5) VDS = 40 V
(5) VDS = 40 V
(6) VDS = 45 V
(6) VDS = 45 V
(7) VDS = 50 V
(7) VDS = 50 V
Power gain as a function of output power;
typical values
BLF178XR_BLF178XRS
Product data sheet
3/:
IDq = 40 mA; f = 108 MHz; tp = 100 s;  = 20 %.
(1) VDS = 20 V
Fig 9.
Fig 10. Drain efficiency as a function of output power;
typical values
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
8 of 14
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
8. Package outline
Flanged balanced ceramic package; 2 mounting holes; 4 leads
SOT539A
D
A
F
D1
U1
B
q
C
w2 M C M
H1
1
c
2
E1
p
H U2
5
L
3
A
E
w1 M A M B M
4
w3 M
b
Q
e
0
5
10 mm
scale
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
UNIT
A
mm
4.7
4.2
inches
b
c
D
D1
e
E
E1
11.81 0.18 31.55 31.52
9.50
13.72
11.56 0.10 30.94 30.96
9.30
9.53
9.27
F
H
H1
L
1.75 17.12 25.53 3.48
1.50 16.10 25.27 2.97
p
Q
q
3.30
3.05
2.26
2.01
35.56
U1
U2
w1
41.28 10.29
0.25
41.02 10.03
w2
w3
0.51
0.25
0.374 0.375 0.069 0.674 1.005 0.137 0.130 0.089
0.185 0.465 0.007 1.242 1.241
1.625 0.405
1.400
0.010 0.020 0.010
0.540
0.366 0.365 0.059 0.634 0.995 0.117 0.120 0.079
0.165 0.455 0.004 1.218 1.219
1.615 0.395
Note
1. millimeter dimensions are derived from the original inch dimensions.
2. recommended screw pitch dimension of 1.52 inch (38.6 mm) based on M3 screw.
OUTLINE
VERSION
REFERENCES
IEC
JEDEC
EIAJ
EUROPEAN
PROJECTION
ISSUE DATE
10-02-02
12-05-02
SOT539A
Fig 11. Package outline SOT539A
BLF178XR_BLF178XRS
Product data sheet
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
9 of 14
BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
Earless flanged balanced ceramic package; 4 leads
SOT539B
D
A
F
5
D1
D
U1
H1
w2
1
c
D
2
E1
U2
H
E
L
3
4
w3
b
Q
e
0
5
10 mm
scale
Dimensions
Unit(1)
w2
w3
0.25
0.25
max 0.185 0.465 0.007 1.242 1.241 0.374 0.375
0.069 0.674 1.005 0.137 0.089 1.275 0.405
0.54
inches nom
0.01
min 0.165 0.455 0.004 1.218 1.219 0.366 0.365
0.059 0.634 0.995 0.117 0.079 1.265 0.395
0.01
mm
max
nom
min
A
b
E
E1
4.7
11.81
0.18 31.55 31.52
c
D
D1
9.5
9.53
e
4.2
11.56
0.10 30.94 30.96
9.3
9.27
F
H
H1
L
Q
U1
U2
1.75 17.12 25.53 3.48
2.26 32.39 10.29
1.50 16.10 25.27 2.97
2.01 32.13 10.03
13.72
Note
1. millimeter dimensions are derived from the original inch dimensions.
Outline
version
References
IEC
JEDEC
JEITA
sot539b_po
European
projection
Issue date
12-05-02
13-05-24
SOT539B
Fig 12. Package outline SOT539B
BLF178XR_BLF178XRS
Product data sheet
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
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BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
9. Handling information
CAUTION
This device is sensitive to ElectroStatic Discharge (ESD). Observe precautions for handling
electrostatic sensitive devices.
Such precautions are described in the ANSI/ESD S20.20, IEC/ST 61340-5, JESD625-A or
equivalent standards.
10. Abbreviations
Table 11.
Abbreviations
Acronym
Description
CW
Continuous Wave
ESD
ElectroStatic Discharge
HF
High Frequency
LDMOS
Laterally Diffused Metal-Oxide Semiconductor
LDMOST
Laterally Diffused Metal-Oxide Semiconductor Transistor
SMD
Surface Mounted Device
VSWR
Voltage Standing-Wave Ratio
11. Revision history
Table 12.
Revision history
Document ID
Release date
Data sheet status
Change notice
Supersedes
BLF178XR_BLF178XRS v.4
20130712
Product data sheet
-
BLF178XR_BLF178XRS v.3
Modifications:
BLF178XR_BLF178XRS v.3
Modifications:
•
The package outline Figure 12 is updated.
20120625
•
Product data sheet
-
BLF178XR_BLF178XRS v.2
The status of this document has been changed to Product data sheet.
BLF178XR_BLF178XRS v.2
20120515
Preliminary data sheet -
BLF178XR_BLF178XRS v.1
BLF178XR_BLF178XRS v.1
20120130
Objective data sheet
-
BLF178XR_BLF178XRS
Product data sheet
-
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Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
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BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
12. Legal information
12.1 Data sheet status
Document status[1][2]
Product status[3]
Definition
Objective [short] data sheet
Development
This document contains data from the objective specification for product development.
Preliminary [short] data sheet
Qualification
This document contains data from the preliminary specification.
Product [short] data sheet
Production
This document contains the product specification.
[1]
Please consult the most recently issued document before initiating or completing a design.
[2]
The term ‘short data sheet’ is explained in section “Definitions”.
[3]
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
12.2 Definitions
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
12.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
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Notwithstanding any damages that customer might incur for any reason
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Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
BLF178XR_BLF178XRS
Product data sheet
Suitability for use — NXP Semiconductors products are not designed,
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
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inclusion and/or use of NXP Semiconductors products in such equipment or
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Applications — Applications that are described herein for any of these
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representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
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accepts no liability for any assistance with applications or customer product
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damage, costs or problem which is based on any weakness or default in the
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the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
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applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
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construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
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BLF178XR; BLF178XRS
NXP Semiconductors
Power LDMOS transistor
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may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
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the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
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In the event that customer uses the product for design-in and use in
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Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
12.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
13. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
BLF178XR_BLF178XRS
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 4 — 12 July 2013
© NXP B.V. 2013. All rights reserved.
13 of 14
NXP Semiconductors
BLF178XR; BLF178XRS
Power LDMOS transistor
14. Contents
1
1.1
1.2
1.3
2
3
4
5
6
7
7.1
7.2
7.3
7.4
7.4.1
8
9
10
11
12
12.1
12.2
12.3
12.4
13
14
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
General description . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits . . . . . . . . . . . . . . . . . . . . 1
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1
Pinning information . . . . . . . . . . . . . . . . . . . . . . 2
Ordering information . . . . . . . . . . . . . . . . . . . . . 2
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2
Thermal characteristics . . . . . . . . . . . . . . . . . . 3
Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Test information . . . . . . . . . . . . . . . . . . . . . . . . . 5
Ruggedness in class-AB operation . . . . . . . . . 5
Impedance information . . . . . . . . . . . . . . . . . . . 5
Test circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6
Graphical data . . . . . . . . . . . . . . . . . . . . . . . . . 7
1-Tone CW pulsed . . . . . . . . . . . . . . . . . . . . . . 7
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9
Handling information. . . . . . . . . . . . . . . . . . . . 11
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . . 11
Revision history . . . . . . . . . . . . . . . . . . . . . . . . 11
Legal information. . . . . . . . . . . . . . . . . . . . . . . 12
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Contact information. . . . . . . . . . . . . . . . . . . . . 13
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2013.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 12 July 2013
Document identifier: BLF178XR_BLF178XRS