PHILIPS PMCXB900UE

DF
N1
0
10B
-6
PMCXB900UE
20 V, complementary N/P-channel Trench MOSFET
7 October 2013
Product data sheet
1. General description
Complementary N/P-channel enhancement mode Field-Effect Transistor (FET) in a
leadless ultra small DFN1010B-6 (SOT1216) Surface-Mounted Device (SMD) plastic
package using Trench MOSFET technology.
2. Features and benefits
•
•
•
•
Trench MOSFET technology
Very low threshold voltage for portable applications: VGS(th) = 0.7 V
Leadless ultra small and ultra thin SMD plastic package: 1.1 × 1.0 × 0.37 mm
ElectroStatic Discharge (ESD) protection > 1 kV HBM
3. Applications
•
•
•
•
Relay driver
High-speed line driver
Level shifter
Power management in battery-driven portables
4. Quick reference data
Table 1.
Quick reference data
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VGS = 4.5 V; ID = 600 mA; Tj = 25 °C
-
470
620
mΩ
VGS = -4.5 V; ID = -500 mA; Tj = 25 °C
-
1.02
1.4
Ω
-
-
20
V
-
-
600
mA
-
-
-20
V
-
-
-500
mA
TR1 (N-channel), Static characteristics
RDSon
drain-source on-state
resistance
TR2 (P-channel), Static characteristics
RDSon
drain-source on-state
resistance
TR1 (N-channel)
VDS
drain-source voltage
Tj = 25 °C
ID
drain current
VGS = 4.5 V; Tamb = 25 °C
[1]
TR2 (P-channel)
VDS
drain-source voltage
Tj = 25 °C
ID
drain current
VGS = -4.5 V; Tamb = 25 °C
Scan or click this QR code to view the latest information for this product
[1]
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
[1]
2
Device mounted on an FR4 PCB, single-sided copper, tin-plated and mounting pad for drain 1 cm .
5. Pinning information
Table 2.
Pinning information
Pin
Symbol Description
1
S1
Simplified outline
Graphic symbol
source TR1
D2
D1
1
6
2
G1
gate TR1
3
D2
drain TR2
4
S2
source TR2
5
G2
gate TR2
6
D1
drain TR1
Transparent top view
7
D1
drain TR1
DFN1010B-6 (SOT1216)
8
D2
drain TR2
7
2
3
5
8
G1
G2
4
S1
S2
017aaa262
6. Ordering information
Table 3.
Ordering information
Type number
PMCXB900UE
PMCXB900UE
Product data sheet
Package
Name
Description
Version
DFN1010B-6
DFN1010B-6: plastic thermal enhanced ultra thin small outline
package; no leads; 6 terminals
SOT1216
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PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
7. Marking
Table 4.
Marking codes
Type number
Marking code
PMCXB900UE
10 00 00
MARKING CODE
(EXAMPLE)
READING
DIRECTION
MARK-FREE AREA
PIN 1
INDICATION MARK
VENDOR CODE
READING EXAMPLE:
11
01
10
Fig. 1.
YEAR DATE
CODE
aaa-007665
DFN1010B-6 (SOT1216) binary marking code description
8. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
Parameter
Conditions
Min
Max
Unit
Tj = 25 °C
-
20
V
-8
8
V
TR1 (N-channel)
VDS
drain-source voltage
VGS
gate-source voltage
ID
drain current
VGS = 4.5 V; Tamb = 25 °C
[1]
-
600
mA
VGS = 4.5 V; Tamb = 100 °C
[1]
-
400
mA
-
2.5
A
[2]
-
265
mW
[1]
-
380
mW
-
4025
mW
-
400
mA
-
-20
V
-8
8
V
IDM
peak drain current
Tamb = 25 °C; single pulse; tp ≤ 10 µs
Ptot
total power dissipation
Tamb = 25 °C
Tsp = 25 °C
TR1 (N-channel), Source-drain diode
IS
source current
Tamb = 25 °C
[1]
TR2 (P-channel)
VDS
drain-source voltage
VGS
gate-source voltage
PMCXB900UE
Product data sheet
Tj = 25 °C
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3 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
Symbol
Parameter
Conditions
ID
drain current
VGS = -4.5 V; Tamb = 25 °C
VGS = -4.5 V; Tamb = 100 °C
IDM
peak drain current
Tamb = 25 °C; single pulse; tp ≤ 10 µs
Ptot
total power dissipation
Tamb = 25 °C
Min
Max
Unit
[1]
-
-500
mA
[1]
-
-300
mA
-
-2
A
[2]
-
265
mW
[1]
-
380
mW
-
4025
mW
-
-350
mA
Tsp = 25 °C
TR2 (P-channel), Source-drain diode
IS
source current
Tamb = 25 °C
[1]
Per device
Tj
junction temperature
-55
150
°C
Tamb
ambient temperature
-55
150
°C
Tstg
storage temperature
-65
150
°C
[1]
[2]
2
Device mounted on an FR4 PCB, single-sided copper, tin-plated and mounting pad for drain 1 cm .
Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard
footprint.
017aaa123
120
Pder
(%)
Ider
(%)
80
80
40
40
0
- 75
Fig. 2.
017aaa124
120
- 25
25
75
125
Tj (°C)
0
- 75
175
MOSFET transistor: Normalized total
power dissipation as a function of junction
temperature
PMCXB900UE
Product data sheet
Fig. 3.
- 25
75
125
Tj (°C)
175
MOSFET transistor: Normalized continuous
drain current as a function of junction
temperature
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7 October 2013
25
© NXP N.V. 2013. All rights reserved
4 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
aaa-008997
10
Limit RDSon = VDS/ID
ID
(A)
tp = 10 µs
1
tp = 100 µs
10-1
tp = 1 ms
DC; Tsp = 25 °C
tp = 10 ms
DC; Tamb = 25 °C;
drain mounting pad 1 cm2
10-2
10-1
1
tp = 100 ms
10
VDS (V)
102
IDM = single pulse
Fig. 4.
TR1 (N-channel): safe operating area; junction to ambient; continuous and peak drain currents as a
function of drain-source voltage
aaa-006901
-10
ID
(A)
Limit RDSon = VDS/ID
tp =
10 µs
-1
100 µs
1 ms
-10-1
DC; Tsp = 25 °C
10 ms
DC; Tamb = 25 °C;
drain mounting pad 1 cm2
-10-2
-10-1
-1
100 ms
-10
VDS (V)
-102
IDM = single pulse
Fig. 5.
TR2 (P-channel): safe operating area; junction to ambient; continuous and peak drain currents as a
function of drain-source voltage
PMCXB900UE
Product data sheet
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5 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
9. Thermal characteristics
Table 6.
Thermal characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
[1]
-
410
475
K/W
[2]
-
285
330
K/W
-
27
31
K/W
[1]
-
410
475
K/W
[2]
-
285
330
K/W
-
27
31
K/W
TR1 (N-channel)
Rth(j-a)
thermal resistance
from junction to
ambient
Rth(j-sp)
in free air
thermal resistance
from junction to solder
point
TR2 (P-channel)
Rth(j-a)
thermal resistance
from junction to
ambient
Rth(j-sp)
in free air
thermal resistance
from junction to solder
point
[1]
[2]
Device mounted on an FR4 PCB, single-sided copper; tin-plated and standard footprint.
2
Device mounted on an FR4 PCB, single-sided copper, tin-plated and mounting pad for drain 1 cm .
aaa-006902
103
duty cycle = 1
Zth(j-a)
(K/W)
0.75
0.5
102
0.25
0.33
0.2
0.1
0.05
0
10
10-3
0.02
0.01
10-2
10-1
1
10
102
tp (s)
103
FR4 PCB, standard footprint
Fig. 6.
TR1 and TR2: transient thermal impedance from junction to ambient as a function of pulse duration;
typical values
PMCXB900UE
Product data sheet
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7 October 2013
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6 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
aaa-006903
103
Zth(j-a)
(K/W)
duty cycle = 1
0.75
0.5
102
0.33
0.25
0.2
0.1
0.05
0.02
0.01
0
10
10-3
10-2
10-1
FR4 PCB, mounting pad for drain 1 cm
Fig. 7.
1
102
10
103
tp (s)
2
TR1 and TR2: transient thermal impedance from junction to ambient as a function of pulse duration;
typical values
10. Characteristics
Table 7.
Characteristics
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
TR1 (N-channel), Static characteristics
V(BR)DSS
drain-source
breakdown voltage
ID = 250 µA; VGS = 0 V; Tj = 25 °C
20
-
-
V
VGSth
gate-source threshold
voltage
ID = 250 µA; VDS = VGS; Tj = 25 °C
0.45
0.7
0.95
V
IDSS
drain leakage current
VDS = 20 V; VGS = 0 V; Tj = 25 °C
-
-
1
µA
IGSS
gate leakage current
VGS = 8 V; VDS = 0 V; Tj = 25 °C
-
-
10
µA
VGS = -8 V; VDS = 0 V; Tj = 25 °C
-
-
-10
µA
VGS = 4.5 V; VDS = 0 V; Tj = 25 °C
-
-
1
µA
VGS = -4.5 V; VDS = 0 V; Tj = 25 °C
-
-
-1
µA
VGS = 4.5 V; ID = 600 mA; Tj = 25 °C
-
470
620
mΩ
VGS = 4.5 V; ID = 600 mA; Tj = 150 °C
-
760
1000
mΩ
VGS = 2.5 V; ID = 500 mA; Tj = 25 °C
-
620
850
mΩ
VGS = 1.8 V; ID = 100 mA; Tj = 25 °C
-
845
1300
mΩ
VGS = 1.5 V; ID = 10 mA; Tj = 25 °C
-
1125
3000
mΩ
VGS = 1.2 V; ID = 1 mA; Tj = 25 °C
-
2210
-
mΩ
VDS = 5 V; ID = 600 mA; Tj = 25 °C
-
1
-
S
RDSon
gfs
drain-source on-state
resistance
transfer conductance
PMCXB900UE
Product data sheet
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7 October 2013
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7 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
TR1 (N-channel), Dynamic characteristics
QG(tot)
total gate charge
VDS = 10 V; ID = 600 mA; VGS = 4.5 V;
-
0.4
0.7
nC
QGS
gate-source charge
Tj = 25 °C
-
0.1
-
nC
QGD
gate-drain charge
-
0.1
-
nC
Ciss
input capacitance
VDS = 10 V; f = 1 MHz; VGS = 0 V;
-
21.3
-
pF
Coss
output capacitance
Tj = 25 °C
-
5.4
-
pF
Crss
reverse transfer
capacitance
-
4.2
-
pF
td(on)
turn-on delay time
VDS = 10 V; ID = 600 mA; VGS = 4.5 V;
-
5.6
-
ns
tr
rise time
RG(ext) = 6 Ω; Tj = 25 °C
-
9.2
-
ns
td(off)
turn-off delay time
-
19
-
ns
tf
fall time
-
51
-
ns
IS = 360 mA; VGS = 0 V; Tj = 25 °C
-
0.8
1.2
V
TR1 (N-channel), Source-drain diode characteristics
VSD
source-drain voltage
TR2 (P-channel), Static characteristics
V(BR)DSS
drain-source
breakdown voltage
ID = -250 µA; VGS = 0 V; Tj = 25 °C
-20
-
-
V
VGSth
gate-source threshold
voltage
ID = -250 µA; VDS = VGS; Tj = 25 °C
-0.45
-0.7
-0.95
V
IDSS
drain leakage current
VDS = -20 V; VGS = 0 V; Tj = 25 °C
-
-
-1
µA
IGSS
gate leakage current
VGS = 8 V; VDS = 0 V; Tj = 25 °C
-
-
10
µA
VGS = -8 V; VDS = 0 V; Tj = 25 °C
-
-
-10
µA
VGS = 4.5 V; VDS = 0 V; Tj = 25 °C
-
-
1
µA
VGS = -4.5 V; VDS = 0 V; Tj = 25 °C
-
-
-1
µA
VGS = -4.5 V; ID = -500 mA; Tj = 25 °C
-
1.02
1.4
Ω
VGS = -4.5 V; ID = -500 mA; Tj = 150 °C
-
1.54
2.1
Ω
VGS = -2.5 V; ID = -200 mA; Tj = 25 °C
-
1.27
2.2
Ω
VGS = -1.8 V; ID = -40 mA; Tj = 25 °C
-
1.7
3.3
Ω
VGS = -1.5 V; ID = -10 mA; Tj = 25 °C
-
2.3
5
Ω
VGS = -1.2 V; ID = -1 mA; Tj = 25 °C
-
3.5
-
Ω
VDS = -10 V; ID = -500 mA; Tj = 25 °C
-
480
-
mS
RDSon
gfs
drain-source on-state
resistance
transfer conductance
TR2 (P-channel), Dynamic characteristics
QG(tot)
total gate charge
VDS = -10 V; ID = -450 mA;
-
1.19
2.1
nC
QGS
gate-source charge
VGS = -4.5 V; Tj = 25 °C
-
0.17
-
nC
QGD
gate-drain charge
-
0.1
-
nC
PMCXB900UE
Product data sheet
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7 October 2013
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8 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
Ciss
input capacitance
VDS = -10 V; f = 1 MHz; VGS = 0 V;
-
43
-
pF
Coss
output capacitance
Tj = 25 °C
-
14
-
pF
Crss
reverse transfer
capacitance
-
8
-
pF
td(on)
turn-on delay time
VDS = -10 V; ID = -450 mA;
-
2.3
-
ns
tr
rise time
VGS = -4.5 V; RG(ext) = 6 Ω; Tj = 25 °C
-
5
-
ns
td(off)
turn-off delay time
-
13.5
-
ns
tf
fall time
-
6
-
ns
-
-0.7
-1.2
V
TR2 (P-channel), Source-drain diode characteristics
VSD
source-drain voltage
IS = -115 mA; VGS = 0 V; Tj = 25 °C
aaa-008998
2.5
4.5 V
ID
(A)
aaa-008999
10-3
ID
(A)
2.0
2.5 V
10-4
1.5
min
1.0
1.8 V
0.5
typ
max
10-5
1.5 V
VGS = 1.2 V
0
Fig. 8.
0
1
2
3
VDS (V)
4
10-6
0
0.5
1.0
VGS (V)
1.5
Tj = 25 °C
Tj = 25 °C; VDS = 5 V
TR1: output characteristics; drain current as a Fig. 9.
function of drain-source voltage; typical values
TR1: sub-threshold drain current as a function
of gate-source voltage
PMCXB900UE
Product data sheet
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PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
aaa-009000
3
RDSon
(Ω)
1.5 V
1.2 V
1.8 V
aaa-009001
3
2V
RDSon
(Ω)
2.5 V
2
2
3V
1
1
Tj = 150 °C
VGS = 4.5 V
0
0
0.5
1.0
1.5
2.0
ID (A)
Tj = 25 °C
0
2.5
Tj = 25 °C
0
1
2
3
4
VGS (V)
5
ID = 0.6 A
Fig. 10. TR1: drain-source on-state resistance as a
function of drain current; typical values
Fig. 11. TR1: drain-source on-state resistance as a
function of gate-source voltage; typical values
aaa-009002
2.5
aaa-009003
2.0
ID
(A)
a
2.0
1.5
1.5
1.0
1.0
Tj = 150 °C
0.5
0
0
1
Tj = 25 °C
2
0.5
3
4
VGS (V)
0
-60
5
VDS > ID × RDSon
Fig. 12. TR1: transfer characteristics; drain current as a
function of gate-source voltage; typical values
PMCXB900UE
Product data sheet
0
60
120
Tj (°C)
180
Fig. 13. TR1: normalized drain-source on-state
resistance as a function of junction
temperature; typical values
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10 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
aaa-009004
1.5
aaa-009005
102
VGS(th)
(V)
C
(pF)
1.0
Ciss
10
max
Coss
0.5
typ
Crss
min
0
-60
0
60
120
Tj (°C)
1
10-1
180
ID = 0.25 mA; VDS = VGS
1
10
VDS (V)
102
f = 1 MHz; VGS = 0 V
Fig. 14. TR1: gate-source threshold voltage as a
function of junction temperature
Fig. 15. TR1: input, output and reverse transfer
capacitances as a function of drain-source
voltage; typical values
aaa-009006
5
VDS
VGS
(V)
ID
4
VGS(pl)
3
VGS(th)
VGS
2
QGS1
QGS2
QGS
1
QGD
QG(tot)
017aaa137
0
0
0.1
0.2
0.3
Fig. 17. Gate charge waveform definitions
0.4
0.5
QG (nC)
ID = 0.6 A; VDS = 10 V; Tamb = 25 °C
Fig. 16. TR1: gate-source voltage as a function of gate
charge; typical values
PMCXB900UE
Product data sheet
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11 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
aaa-009007
2.5
aaa-006904
-2.0
IS
(A)
VGS = -4.5 V
ID
(A)
2.0
-3.5 V
-1.5
-3 V
1.5
-1.0
-2.5 V
-0.5
-1.8 V
1.0
0.5
Tj = 150 °C
Tj = 25 °C
-1.2 V
0
0
0.4
0.8
1.2
0.0
1.6
2.0
VSD (V)
VGS = 0 V
0
-1
-2
-3
VDS (V)
-4
Tj = 25 °C
Fig. 18. TR1: source current as a function of sourcedrain voltage; typical values
Fig. 19. TR2: output characteristics; drain current as a
function of drain-source voltage; typical values
aaa-006905
-10-2
aaa-006906
2.0
ID
(A)
RDSon
(Ω)
-10-3
-1.8 V
-2.2 V
1.5
min
typ
-2.5 V
-3 V
max
-3.5 V
-10-4
1.0
VGS = -4.5 V
-10-5
-10-6
0.0
0.5
-0.5
-1.0
VGS (V)
0.0
0.0
-1.5
Tj = 25 °C; VDS = -5 V
Product data sheet
-1.0
-1.5
ID (V)
-2.0
Tj = 25 °C
Fig. 20. TR2: sub-threshold drain current as a function
of gate-source voltage
PMCXB900UE
-0.5
Fig. 21. TR2: drain-source on-state resistance as a
function of drain current; typical values
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12 / 20
PMCXB900UE
NXP Semiconductors
20 V, complementary N/P-channel Trench MOSFET
aaa-006907
5
aaa-006908
-1.00
RDSon
(Ω)
ID
(A)
4
Tj = 25 °C
-0.75
Tj = 150 °C
3
-0.50
2
Tj = 150 °C
-0.25
1
0
Tj = 25 °C
0
-1
-2
-3
-4
VGS (V)
0.00
-5
ID = -0.5 A
0
-1
-2
-3
VGS (V)
-4
VDS > ID × RDSon
Fig. 22. TR2: drain-source on-state resistance as a
function of gate-source voltage; typical values
aaa-006909
1.50
a
Fig. 23. TR2: transfer characteristics; drain current as a
function of gate-source voltage; typical values
aaa-006910
-1.5
VGS(th)
(V)
1.25
-1.0
max
1.00
typ
-0.5
0.75
0.50
-60
min
0
60
120
Tj (°C)
Fig. 24. TR2: normalized drain-source on-state
resistance as a function of junction
temperature; typical values
PMCXB900UE
Product data sheet
0.0
-60
180
0
60
120
Tj (°C)
180
ID = -0.25 mA; VDS = VGS
Fig. 25. TR2: gate-source threshold voltage as a
function of junction temperature
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PMCXB900UE
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20 V, complementary N/P-channel Trench MOSFET
aaa-006911
102
aaa-006912
-5
VGS
(V)
Ciss
-4
C
(pF)
Coss
-3
10
Crss
-2
-1
1
-10-1
-1
-10
VDS (V)
0
-102
0
0.2
0.4
QG (nC)
0.6
ID = -0.45 A; VDS = -10 V; Tamb = 25 °C
f = 1 MHz; VGS = 0 V
Fig. 26. TR2: input, output and reverse transfer
capacitances as a function of drain-source
voltage; typical values
Fig. 27. TR2: gate-source voltage as a function of gate
charge; typical values
aaa-006913
-2.0
VDS
IS
(A)
ID
-1.5
VGS(pl)
VGS(th)
-1.0
VGS
QGS1
QGS2
QGS
-0.5
QGD
Tj = 150 °C
Tj = 25 °C
QG(tot)
017aaa137
0.0
0.0
Fig. 28. Gate charge waveform definitions
-0.5
-1.0
-1.5
VSD (V)
-2.0
VGS = 0 V
Fig. 29. TR2: source current as a function of sourcedrain voltage; typical values
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11. Test information
P
t2
t1
t2
duty cycle δ =
t1
t
006aaa812
Fig. 30. Duty cycle definition
12. Package outline
0.35
0.35
0.15
0.23
1
3
0.125
0.205
0.22
0.30
0.95
1.05
6
0.04
max
2
0.34
0.40
Dimensions in mm
5
4
0.32
0.40
0.275 0.275
1.05
1.15
13-03-05
Fig. 31. Package outline DFN1010B-6 (SOT1216)
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13. Soldering
Footprint information for reflow soldering of DFN1010B-6 package
SOT1216
0.9
0.35
0.35
0.15 0.2 (6x) 0.15
1.3
1.2
0.35
0.25
0.5
0.6
0.35
0.25
1.1
0.3 (6x)
1
1.35
solder land
solder land plus solder paste
occupied area
solder resist
Dimensions in mm
Issue date
12-11-23
13-03-06
sot1216_fr
Fig. 32. Reflow soldering footprint for DFN1010B-6 (SOT1216)
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14. Revision history
Table 8.
Revision history
Data sheet ID
Release date
Data sheet status
Change notice
Supersedes
PMCXB900UE v.1
20131007
Product data sheet
-
-
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In no event shall NXP Semiconductors be liable for any indirect, incidental,
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or replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
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Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Document
status [1][2]
Product
status [3]
Objective
[short] data
sheet
Development This document contains data from
the objective specification for product
development.
Preliminary
[short] data
sheet
Qualification
This document contains data from the
preliminary specification.
Product
[short] data
sheet
Production
This document contains the product
specification.
[1]
[2]
[3]
Definition
Right to make changes — NXP Semiconductors reserves the right to
make changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
Please consult the most recently issued document before initiating or
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The term 'short data sheet' is explained in section "Definitions".
The product status of device(s) described in this document may have
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Short data sheet — A short data sheet is an extract from a full data sheet
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Product data sheet.
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in the customer’s applications or products, or the application or use by
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Semiconductors products in order to avoid a default of the applications
and the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
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Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
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products are sold subject to the general terms and conditions of commercial
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No offer to sell or license — Nothing in this document may be interpreted
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grant, conveyance or implication of any license under any copyrights, patents
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In the event that customer uses the product for design-in and use in
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15.4 Trademarks
Notice: All referenced brands, product names, service names and
trademarks are the property of their respective owners.
Adelante, Bitport, Bitsound, CoolFlux, CoReUse, DESFire, EZ-HV,
FabKey, GreenChip, HiPerSmart, HITAG, I²C-bus logo, ICODE, I-CODE,
ITEC, Labelution, MIFARE, MIFARE Plus, MIFARE Ultralight, MoReUse,
QLPAK, Silicon Tuner, SiliconMAX, SmartXA, STARplug, TOPFET,
TrenchMOS, TriMedia and UCODE — are trademarks of NXP B.V.
HD Radio and HD Radio logo — are trademarks of iBiquity Digital
Corporation.
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16. Contents
1
General description ............................................... 1
2
Features and benefits ............................................1
3
Applications ........................................................... 1
4
Quick reference data ............................................. 1
5
Pinning information ............................................... 2
6
Ordering information ............................................. 2
7
Marking ................................................................... 3
8
Limiting values .......................................................3
9
Thermal characteristics .........................................6
10
Characteristics ....................................................... 7
11
Test information ................................................... 15
12
Package outline ................................................... 15
13
Soldering .............................................................. 16
14
Revision history ................................................... 17
15
15.1
15.2
15.3
15.4
Legal information .................................................18
Data sheet status ............................................... 18
Definitions ...........................................................18
Disclaimers .........................................................18
Trademarks ........................................................ 19
© NXP N.V. 2013. All rights reserved
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: [email protected]
Date of release: 7 October 2013
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