5962-9955702QPA SMD

REVISIONS
LTR
DESCRIPTION
DATE (YR-MO-DA)
APPROVED
A
Drawing updated to reflect current requirements. - gt
02-05-22
Raymond Monnin
B
Redrawn. Update paragraphs to MIL-PRF-38535 requirements. Remove
class M requirements throughout. - drw
14-06-12
Charles F. Saffle
C
Make change to recommended operating conditions for high (VIH) and
low (VIL) level digital input voltage levels in 1.4 herein. -rrp
15-05-18
Charles F. Saffle
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PMIC N/A
PREPARED BY
Rick Officer
STANDARD
MICROCIRCUIT
DRAWING
DLA LAND AND MARITIME
COLUMBUS, OHIO 43218-3990
http://www.landandmaritime.dla.mil
CHECKED BY
Rajesh Pithadia
APPROVED BY
THIS DRAWING IS AVAILABLE
FOR USE BY ALL
DEPARTMENTS
AND AGENCIES OF THE
DEPARTMENT OF DEFENSE
AMSC N/A
Raymond Monnin
DRAWING APPROVAL DATE
99-10-20
REVISION LEVEL
C
MICROCIRCUIT, DIGITAL-LINEAR, DUAL, 12-BIT,
PROGRAMMABLE, DIGITAL-TO-ANALOG
CONVERTER, MONOLITHIC SILICON
SIZE
CAGE CODE
A
67268
SHEET
DSCC FORM 2233
APR 97
5962-99557
1 OF 13
5962-E323-15
1. SCOPE
1.1 Scope. This drawing documents two product assurance class levels consisting of high reliability (device class Q) and
space application (device class V). A choice of case outlines and lead finishes are available and are reflected in the Part or
Identifying Number (PIN). When available, a choice of Radiation Hardness Assurance (RHA) levels is reflected in the PIN.
1.2 PIN. The PIN is as shown in the following example:
5962
-
99557
Federal
stock class
designator
\
RHA
designator
(see 1.2.1)
01
Q
P
A
Device
type
(see 1.2.2)
Device
class
designator
(see 1.2.3)
Case
outline
(see 1.2.4)
Lead
finish
(see 1.2.5)
/
\/
Drawing number
1.2.1 RHA designator. Device classes Q and V RHA marked devices meet the MIL-PRF-38535 specified RHA levels and are
marked with the appropriate RHA designator. A dash (-) indicates a non-RHA device.
1.2.2 Device types. The device types identify the circuit function as follows:
Device type
Generic number
01
TLV5618AM
02
TLC5618AM
Circuit function
Dual, 12-bit, programmable digital-to-analog
converter with power down
Dual, 12-bit, programmable digital-to-analog
converter
1.2.3 Device class designator. The device class designator is a single letter identifying the product assurance level as
follows:
Device class
Device requirements documentation
Q or V
Certification and qualification to MIL-PRF-38535
1.2.4 Case outlines. The case outlines are as designated in MIL-STD-1835 as follows:
Outline letter
P
2
Descriptive designator
GDIP1-T8 or CDIP2-T8
CQCC1-N20
Terminals
Package style
8
20
Dual-in-line
Square leadless chip carrier
1.2.5 Lead finish. The lead finish is as specified in MIL-PRF-38535 for device classes Q and V.
STANDARD
MICROCIRCUIT DRAWING
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REVISION LEVEL
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2
1.3 Absolute maximum ratings. 1/
Supply voltage (VDD to AGND) ............................................................................ 7 V
Digital input voltage range to AGND .................................................................... -0.3 V VDD +0.3 V
Reference input voltage range to AGND .............................................................. -0.3 V VDD +0.3 V
Output voltage at OUTPUT pin from external source (device type 02 only) .........
Continuous current at any terminal (device type 02 only) ....................................
Power dissipation (PD): (TA ≤ 25°C)
Case P..............................................................................................................
Case 2 ..............................................................................................................
Junction temperature (TJ) ....................................................................................
Storage temperature range ..................................................................................
Lead temperature 1.6 mm (1/16 inch) from case for 10 seconds .........................
Thermal resistance, junction-to-case (θJC) ..........................................................
VDD +0.3 V
±20 mA
1050 mW 2/
1375 mW 3/
+150°C
-65°C to +150°C
260°C
See MIL-STD-1835
1.4 Recommended operating conditions.
Supply voltage (VDD):
Device type 01:
With VDD = 5 V ............................................................................................. 4.5 V to 5.5 V
With VDD = 3 V ............................................................................................. 2.7 V to 3.3 V
Device type 02 .................................................................................................. 4.5 V to 5.5 V
High level digital input voltage (VIH):
Device type 01:
With VDD = 2.7 V ......................................................................................... 2.0 V minimum
With VDD = 5.5 V ......................................................................................... 2.4 V minimum
Device type 02 (with VDD = 5 V)....................................................................... 0.7 VDD minimum 4/
Low level digital input voltage (VIL):
Device type 01:
With VDD = 2.7 V ......................................................................................... 0.6 V maximum
With VDD = 5.5 V ......................................................................................... 1.0 V maximum
Device type 02 (with VDD = 5 V)....................................................................... 0.3 VDD maximum 4/
Load resistance (RL) ............................................................................................ 2 kΩ
Load capacitance (CL) (device type 01 only) ....................................................... 100 pF maximum
Clock frequency (fCLK) (device type 01 only) ....................................................... 20 MHz
Ambient operating temperature range (TA) .......................................................... -55°C to +125°C
________
1/ Stresses above the absolute maximum rating may cause permanent damage to the device. Extended operation at the
maximum levels may degrade performance and affect reliability.
2/ For case P, the derating factor above TA = +25°C is 8.4 mW/°C.
3/
4/
For case 2, the derating factor above TA = +25°C is 11.0 mW/°C.
This parameter is not production tested.
STANDARD
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COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
5962-99557
A
REVISION LEVEL
C
SHEET
3
2. APPLICABLE DOCUMENTS
2.1 Government specification, standards, and handbooks. The following specification, standards, and handbooks form a part
of this drawing to the extent specified herein. Unless otherwise specified, the issues of these documents are those cited in the
solicitation or contract.
DEPARTMENT OF DEFENSE SPECIFICATION
MIL-PRF-38535 - Integrated Circuits, Manufacturing, General Specification for.
DEPARTMENT OF DEFENSE STANDARDS
MIL-STD-883 MIL-STD-1835 -
Test Method Standard Microcircuits.
Interface Standard Electronic Component Case Outlines.
DEPARTMENT OF DEFENSE HANDBOOKS
MIL-HDBK-103 MIL-HDBK-780 -
List of Standard Microcircuit Drawings.
Standard Microcircuit Drawings.
(Copies of these documents are available online at http://quicksearch.dla.mil or from the Standardization Document Order
Desk, 700 Robbins Avenue, Building 4D, Philadelphia, PA 19111-5094.)
2.2 Order of precedence. In the event of a conflict between the text of this drawing and the references cited herein, the text
of this drawing takes precedence. Nothing in this document, however, supersedes applicable laws and regulations unless a
specific exemption has been obtained.
3. REQUIREMENTS
3.1 Item requirements. The individual item requirements for device classes Q and V shall be in accordance with
MIL-PRF-38535 as specified herein, or as modified in the device manufacturer's Quality Management (QM) plan. The
modification in the QM plan shall not affect the form, fit, or function as described herein.
3.2 Design, construction, and physical dimensions. The design, construction, and physical dimensions shall be as specified
in MIL-PRF-38535 and herein for device classes Q and V.
3.2.1 Case outlines. The case outlines shall be in accordance with 1.2.4 herein.
3.2.2 Terminal connections. The terminal connections shall be as specified on figure 1.
3.2.3 Block diagram. The block diagram shall be as specified on figure 2.
3.3 Electrical performance characteristics and postirradiation parameter limits. Unless otherwise specified herein, the
electrical performance characteristics and postirradiation parameter limits are as specified in table I and shall apply over the full
ambient operating temperature range.
3.4 Electrical test requirements. The electrical test requirements shall be the subgroups specified in table II. The electrical
tests for each subgroup are defined in table I.
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REVISION LEVEL
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SHEET
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TABLE I. Electrical performance characteristics.
Test
Symbol
Group A
subgroups
Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Device
type
Limits
Min
Unit
Max
Power supply section
Power supply current
IDD
DAC latch = 0X800,
fast
1, 2, 3
no load,
slow
01
2.3
mA
1
all inputs = AGND or VDD
VDD = 5.5 V,
fast
02
no load,
slow
2.5
1
all inputs = 0 V or VDD
Reference input section
Input voltage range
VIN
REFIN = 2.048 V
1, 2, 3
01
0
VDD
-1.5
02
0
VDD
-2
V
Digital inputs section
High level digital input
current
IIH
1, 2, 3
VIN = VDD
( DIN, SCLK, CS pins ),
VIN = VDD
Low level digital input
current
IIL
1, 2, 3
VIN = 0 V
( DIN, SCLK, CS pins ),
VIN = 0 V
01
1
02
1
01
-1
02
-1
01
0
µA
µA
Output sections
Output voltage range
VOUT
1, 2, 3
RL = 10 kΩ
( OUTPUT A, OUTPUT B
pins ), RL = 10 kΩ
Output load regulation
accuracy
VOLR
VO = 4.096 V, 2.048 V,
1, 2, 3
RL = 2 kΩ
( OUTPUT A, OUTPUT B
pins ), VO(OUT) = 4.096 V,
VDD
-0.4
02
VDD
-0.4
01
±0.29
02
±0.29
V
% of FS
voltage
RL = 2 kΩ
See footnotes at end of table.
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REVISION LEVEL
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TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Group A
subgroups
Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Device
type
Limits
Min
Unit
Max
Static DAC section
Resolution
RES
1, 2, 3
All
Integral nonlinearity 2/
INL
1, 2, 3
01
±4
02
±4
End point adjusted
12
bits
LSB
Differential nonlinearity 3/
DNL
1, 2, 3
All
±1
LSB
Zero scale error, offset error
at zero scale 4/
EZS
1, 2, 3
All
±12
mV
Gain error
EG
1, 2, 3
All
±0.6
% of FS
voltage
4
02
5/
Analog output dynamic section
CL = 100 pF,
Positive output slew rate
+SR
RL = 10 kΩ, code
32 to code 4096,
Slow
TA = +25°C, VOUT
from 10 % to 90 %
Fast
0.3
V/µs
2.4
CL = 100 pF,
Negative output slew rate
Signal to noise ratio
Signal to noise + distortion
Total harmonic distortion
Spurious free dynamic
range
-SR
SNR
SINAD
THD
SFDR
RL = 10 kΩ, code
4096 to code 32,
Slow
TA = +25°C, VOUT
from 10 % to 90 %
Fast
4
02
0.15
V/µs
1.2
fS = 102 kSPS, fOUT = 1 kHz,
CL = 100 pF, RL = 10 kΩ
fS = 102 kSPS, fOUT = 1 kHz,
CL = 100 pF, RL = 10 kΩ
fS = 102 kSPS, fOUT = 1 kHz,
CL = 100 pF, RL = 10 kΩ
fS = 102 kSPS, fOUT = 1 kHz,
CL = 100 pF, RL = 10 kΩ
4, 5, 6
01
72
dB
4, 5, 6
01
58
dB
4, 5, 6
01
4, 5, 6
01
-57
dB
57
dB
See footnotes at end of table.
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TABLE I. Electrical performance characteristics – continued.
Test
Symbol
Group A
subgroups
Conditions 1/
-55°C ≤ TA ≤ +125°C
unless otherwise specified
Device
type
Limits
Min
Unit
Max
Digital input timing section
tsu
(CSCK)
See figure 3
9, 10, 11
All
5
ns
tsu
(C16CS)
See figure 3
9, 10, 11
All
10
ns
SCLK pulse width high
tWH
See figure 3
9, 10, 11
All
25
ns
SCLK pulse width low
tWL
See figure 3
9, 10, 11
All
25
ns
tsu(D)
See figure 3
9, 10, 11
All
8
ns
th(D)
See figure 3
9, 10, 11
All
5
ns
Setup time, CS low before
first negative SCLK edge
th
Setup time, 16 negative
SCLK edge before CS
rising edge
Setup time, data ready
before SCLK falling edge
Hold time, data held valid
after SCLK falling edge
1/
Unless otherwise specified, VDD = 2.7 V to 5.5 V for device type 01. VDD = 5 V ±5 %, Vref(REFIN) = 2.048 V for device
type 02.
2/
The relative accuracy or integral nonlinearity (INL) sometimes referred to as linearity error, is the maximum deviation of the
output from the line between zero and full scale excluding the effects of zero code and full scale errors.
3/
The differential nonlinearity (DNL) sometimes referred to as differential error, is the difference between the measure and
ideal 1 LSB amplitude change of any two adjacent codes. Monotonic means the output voltage changes in the same
direction (or remains constant) as a change in the digital input code.
4/
Zero scale error is the deviation from zero voltage output when the digital input code is zero.
5/
Gain error is the deviation from the ideal output (2 Vref – 1 LSB) with an output load of 10 kΩ.
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Device types
Case outlines
01 and 02
P
Terminal
number
2
Terminal symbol
1
DIN
NC
2
SCLK
DIN
3
CS
NC
4
OUTPUT A
NC
5
AGND
SCLK
6
REFIN
NC
7
OUTPUT B
CS
8
VDD
NC
9
---
NC
10
---
OIUTPUT A
11
---
NC
12
---
AGND
13
---
NC
14
---
NC
15
---
REFIN
16
---
NC
17
---
OUTPUT B
18
---
NC
19
---
NC
20
---
VDD
NC = No connection
FIGURE 1. Terminal connections.
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Device type 01
Terminal symbol
I/O/P
Description
AGND
P
Ground
CS
I
Chip select. Digital input active low,
used to enable/disable inputs.
DIN
I
Digital serial data input
OUTPUT A
O
DAC A analog output
OUTPUT B
O
DAC B analog output
REFIN
I
Analog reference voltage input
SCLK
I
Digital serial clock input
VDD
P
Positive power supply
Device type 02
Terminal symbol
I/O
AGND
Description
Analog ground
CS
I
Chip select, active low
DIN
I
Serial data input
OUTPUT A
O
DAC A analog output
OUTPUT B
O
DAC B analog output
REFIN
I
Reference voltage input
SCLK
I
Serial clock input
VDD
Positive power supply
FIGURE 1. Terminal connections - continued.
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FIGURE 2. Block diagram.
FIGURE 3. Timing waveforms.
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3.5 Marking. The part shall be marked with the PIN listed in 1.2 herein. In addition, the manufacturer's PIN may also be
marked. For packages where marking of the entire SMD PIN number is not feasible due to space limitations, the manufacturer
has the option of not marking the "5962-" on the device. For RHA product using this option, the RHA designator shall still be
marked. Marking for device classes Q and V shall be in accordance with MIL-PRF-38535.
3.5.1 Certification/compliance mark. The certification mark for device classes Q and V shall be a "QML" or "Q" as required in
MIL-PRF-38535. The compliance mark for device class M shall be a "C" as required in MIL-PRF-38535, appendix A.
3.6 Certificate of compliance. For device classes Q and V, a certificate of compliance shall be required from a QML-38535
listed manufacturer in order to supply to the requirements of this drawing (see 6.6.1 herein). The certificate of compliance
submitted to DLA Land and Maritime-VA prior to listing as an approved source of supply for this drawing shall affirm that the
manufacturer's product meets, for device classes Q and V, the requirements of MIL-PRF-38535 and herein.
3.7 Certificate of conformance. A certificate of conformance as required for device classes Q and V in MIL-PRF-38535 shall
be provided with each lot of microcircuits delivered to this drawing.
4. VERIFICATION
4.1 Sampling and inspection. For device classes Q and V, sampling and inspection procedures shall be in accordance with
MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan
shall not affect the form, fit, or function as described herein.
4.2 Screening. For device classes Q and V, screening shall be in accordance with MIL-PRF-38535, and shall be conducted
on all devices prior to qualification and technology conformance inspection.
4.2.1 Additional criteria for device classes Q and V.
a.
The burn-in test duration, test condition and test temperature, or approved alternatives shall be as specified in the
device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under
document revision level control of the device manufacturer's Technology Review Board (TRB) in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall
specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in
method 1015 of MIL-STD-883.
b.
Interim and final electrical test parameters shall be as specified in table II herein.
c.
Additional screening for device class V beyond the requirements of device class Q shall be as specified in
MIL-PRF-38535, appendix B.
4.3 Qualification inspection for device classes Q and V. Qualification inspection for device classes Q and V shall be in
accordance with MIL-PRF-38535. Inspections to be performed shall be those specified in MIL-PRF-38535 and herein for groups
A, B, C, D, and E inspections (see 4.4.1 through 4.4.4).
4.4 Conformance inspection. Technology conformance inspection for classes Q and V shall be in accordance with
MIL-PRF-38535 including groups A, B, C, D, and E inspections and as specified herein.
4.4.1 Group A inspection.
a.
Tests shall be as specified in table II herein.
b.
Subgroups 7 and 8 in table I, method 5005 of MIL-STD-883 shall be omitted.
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TABLE II. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
Device
class Q
class V
---
---
1, 2, 3, 4, 5, 6, 9,
10, 11 1/
1, 2, 3, 4, 5, 6, 9,
10, 11 1/
1, 2, 3, 4, 5, 6, 9,
10, 11
1, 2, 3, 4, 5, 6, 9,
10, 11
1
1
1
1
---
---
1/ PDA applies to subgroup 1.
4.4.2 Group C inspection. The group C inspection end-point electrical parameters shall be as specified in table II herein.
4.4.2.1 Additional criteria for device classes Q and V. The steady-state life test duration, test condition and test temperature,
or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The
test circuit shall be maintained under document revision level control by the device manufacturer's TRB in accordance with
MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the
inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of
MIL-STD-883.
4.4.3 Group D inspection. The group D inspection end-point electrical parameters shall be as specified in table II herein.
4.4.4 Group E inspection. Group E inspection is required only for parts intended to be marked as radiation hardness assured
(see 3.5 herein).
a.
End-point electrical parameters shall be as specified in table II herein.
b.
For device classes Q and V, the devices or test vehicle shall be subjected to radiation hardness assured tests as
specified in MIL-PRF-38535 for the RHA level being tested. All device classes must meet the postirradiation end-point
electrical parameter limits as defined in table I at TA = +25°C ±5°C, after exposure, to the subgroups specified in table II
herein.
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5. PACKAGING
5.1 Packaging requirements. The requirements for packaging shall be in accordance with MIL-PRF-38535 for device classes
Q and V.
6. NOTES
6.1 Intended use. Microcircuits conforming to this drawing are intended for use for Government microcircuit applications
(original equipment), design applications, and logistics purposes.
6.1.1 Replaceability. Microcircuits covered by this drawing will replace the same generic device covered by a contractor
prepared specification or drawing.
6.2 Configuration control of SMD's. All proposed changes to existing SMD's will be coordinated with the users of record for
the individual documents. This coordination will be accomplished using DD Form 1692, Engineering Change Proposal.
6.3 Record of users. Military and industrial users should inform DLA Land and Maritime when a system application requires
configuration control and which SMD's are applicable to that system. DLA Land and Maritime will maintain a record of users and
this list will be used for coordination and distribution of changes to the drawings. Users of drawings covering microelectronic
devices (FSC 5962) should contact DLA Land and Maritime -VA, telephone (614) 692-8108.
6.4 Comments. Comments on this drawing should be directed to DLA Land and Maritime -VA, Columbus, Ohio 43218-3990,
or telephone (614) 692-0540.
6.5 Abbreviations, symbols, and definitions. The abbreviations, symbols, and definitions used herein are defined in
MIL-PRF-38535 and MIL-HDBK-1331.
6.6 Sources of supply.
6.6.1 Sources of supply for device classes Q and V. Sources of supply for device classes Q and V are listed in
MIL-HDBK-103 and QML-38535. The vendors listed in MIL-HDBK-103 and QML-38535 have submitted a certificate of
compliance (see 3.6 herein) to DLA Land and Maritime -VA and have agreed to this drawing.
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REVISION LEVEL
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STANDARD MICROCIRCUIT DRAWING BULLETIN
DATE: 15-05-18
Approved sources of supply for SMD 5962-99557 are listed below for immediate acquisition information only and
shall be added to MIL-HDBK-103 and QML-38535 during the next revision. MIL-HDBK-103 and QML-38535 will be
revised to include the addition or deletion of sources. The vendors listed below have agreed to this drawing and a
certificate of compliance has been submitted to and accepted by DLA Land and Maritime -VA. This information
bulletin is superseded by the next dated revision of MIL-HDBK-103 and QML-38535. DLA Land and Maritime
maintains an online database of all current sources of supply at http://www.landandmaritime.dla.mil/Programs/Smcr/.
Standard
microcircuit drawing
PIN 1/
Vendor
CAGE
number
Vendor
similar
PIN 2/
5962-9955701Q2A
01295
TLV5618AMFKB
5962-9955701QPA
01295
TLV5618AMJGB
5962-9955702Q2A
01295
TLC5618AMFKB
5962-9955702QPA
01295
TLC5618AMJGB
1/ The lead finish shown for each PIN representing
a hermetic package is the most readily available
from the manufacturer listed for that part. If the
desired lead finish is not listed contact the vendor
to determine its availability.
2/ Caution. Do not use this number for item
acquisition. Items acquired to this number may not
satisfy the performance requirements of this drawing.
Vendor CAGE
number
01295
Vendor name
and address
Texas Instruments, Inc.
Semiconductor Group
8505 Forest Lane
P.O. Box 660199
Dallas, TX 75243
Point of contact:
U.S. Highway 75 South
P.O. Box 84, M/S 853
Sherman, TX 75090-9493
The information contained herein is disseminated for convenience only and the
Government assumes no liability whatsoever for any inaccuracies in the
information bulletin.
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