Cypress Semiconductor Product Qualification Report QTP# 071603 VERSION 1.1 April 2008 Video Cable Equalizer Family 0.18um Mixed Mode/RFCMOS Technology Fab8C, UMC-Taiwan CYV15G0101EQ* CYV15G0104EQ* 3.3V Multi-Rate Video Cable Equalizer CYV15G0100EQ* CYV15G0103EQ* 3.3V Prosumer Video Cable Equalizer CYV270M0101EQ* CYV270M0104EQ* 3.3V Adaptive Video Cable Equalizer CYPRESS TECHNICAL CONTACT FOR QUALIFICATION DATA: Rene Rodgers Principal Reliability Engineer (408) 432-2732 Mira Ben-Tzur Quality Engineering Director (408) 943-2675 Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 2 of 9 April 2008 PRODUCT QUALIFICATION HISTORY Qual Report Description of Qualification Purpose Date Comp 060803 New Device Equalizer 7C9150A in UMC Fab8C, 0.18um 1P6M Mixed Mode/RF Process Feb 2007 063804 7C9150 Video Equalizer Rev C Feb 2007 071603 7C9150E Video Cable Equalizer in 0.18um Mixed Mode RFCMOS Technology, UMC-Taiwan Fab8C Sep 2007 Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 3 of 9 April 2008 PRODUCT DESCRIPTION (for qualification) Purpose: Qualify 7C9150 Video Cable Equalizer Device in 0.18um Mixed Mode RFCMOS Technology at UMC-Taiwan, Fab8C Marketing Part #: CYV15G0100EQ*, CYV15G0101EQ*, CYV15G0103EQ*, CYV15G0104EQ*, CYV270M0101EQ*, CYV270M0104EQ* Device Description: 3.3V Video Cable Equalizer Cypress Division: Data Communications Division Number of Metal Layers: TECHNOLOGY/FAB PROCESS DESCRIPTION Metal 1: 150Å Ti / 200Å TiN / 4,000Å Al-Cu / 150Å Ti / 300Å TiN Metal Composition: Metal 2: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN Metal 3: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN Metal 4: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN Metal 5: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN Metal 6: 150Å Ti / 200Å TiN / 8,000Å Al-Cu / 150Å Ti / 300Å TiN SiO2 7,000Å, SiO2 5,000Å , Si3Ni4 10,000Å 6 Passivation Type and Materials: Generic Process Technology/Design Rule (µdrawn): CMOS / 0.18um Gate Oxide Material/Thickness (MOS): Name/Location of Die Fab (prime) Facility: SiO2 ,42 Å (1.8V) SiO2 ,70 Å (3.3V) UMC / Taiwan Die Fab Line ID/Wafer Process ID: Fab8C, Mixed Mode RF PACKAGE AVAILABILITY PACKAGE 16-Lead SOIC ASSEMBLY SITE FACILITY OSE-TAIWAN (T) Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION Package Designation: Package Outline, Type, or Name: Mold Compound Name/Manufacturer: Mold Compound Flammability Rating: SZ16 16-Lead Small Outline Integrated Circuit (SOIC) Cel9220THF V-0 per UL94 Oxygen Rating Index: N/A Lead Frame Material: Copper Lead Finish, Composition / Thickness: NiPdAu Die Backside Preparation Method/Metallization: Backgrind Die Separation Method: Saw Die Attach Supplier/Material: Hitachi EN4900G Die Attach Method: Epoxy Bond Diagram Designation: 001-08878 Wire Bond Method: Thermosonic Wire Material/Size: Au 1.0mil Thermal Resistance Theta JA °C/W: 126 Package Cross Section Yes/No: N/A Assembly Process Flow: 49-35044 Name/Location of Assembly (prime) facility: OSE / Taiwan MSL Level 1 Reflow Profile 260 ELECTRICAL TEST / FINISH DESCRIPTION Test Location: CML-R 071603 V.1.1 Page 4 of 9 April 2008 Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 5 of 9 April 2008 RELIABILITY TESTS PERFORMED PER SPECIFICATION REQUIREMENT Stress/Test High Temperature Operating Life Test Condition (Temp/Bias) Dynamic Operating Condition, Vcc Max=3.80V, 125°C Result P/F P Early Failure Rate High Temperature Operating Life Dynamic Operating Condition, Vcc Max=3.80V, 125°C P Low Temperature Operating Life Dynamic Operating Condition, Vcc Max=3.80V, -30°C P Temperature Cycle JESD22, Method 104C, Condition C, -65°C to 150°C Precondition: JESD22 Moisture Sensitivity Level 1 P Latent Failure Rate 168 Hrs, 85C/85%RH+3IR-Reflow, 260°C+0, -5°C Pressure Cooker 121°C, 100%RH, 15 Psig Precondition: JESD22 Moisture Sensitivity Level 1 168 Hrs, 85C/85%RH+3IR-Reflow, 260 C+0, -5°C Electrostatic Discharge Human Body Model (ESD-HBM) 2200V JESD22, Method A114-E P Electrostatic Discharge Charge Device Model (ESD-CDM) 500V Cypress Spec. 25-00020 P Acoustic Microscopy Spec. 25-00104 P High Temperature Storage 150C, no bias P Latch up Sensitivity 125C, ± 200mA / ± 300mA Cypress Spec. 01-00081 P P Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 6 of 9 April 2008 RELIABILITY FAILURE RATE SUMMARY Stress/Test High Temperature Operating Life Early Failure Rate1 High Temperature Operating Life1,2 Long Term Failure Rate 1 2 3 Device Tested/ Device Hours # Fails Activation Energy Thermal3 A.F Failure Rate 3804 0 N/A N/A 0 PPM 1,026,752 0 0 .7 55 17 FITs Assuming an ambient temperature of 55°C and a junction temperature rise of 15°C. Chi-squared 60% estimations used to calculate the failure rate.F Thermal Acceleration Factor is calculated from the Arrhenius equation ⎡E ⎡ 1 1 ⎤ ⎤ AF = exp ⎢ A ⎢ - ⎥ ⎥ ⎣ k ⎣ T 2 T1 ⎦ ⎦ where: EA =The Activation Energy of the defect mechanism. k = Boltzmann's constant = 8.62x10-5 eV/Kelvin. T1 is the junction temperature of the device under stress and T2 is the junction temperature of the device at use conditions. Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 7 of 9 April 2008 Reliability Test Data QTP #: Device 060803 Fab Lot # Assy Lot # Assy Loc 9601691 610602074 M-PHIL 9601691 610628136 610602074 Duration Samp Rej COMP 26 0 M-PHIL COMP 3 0 M-PHIL COMP 9 0 COMP 9 0 STRESS: ACOUSTIC-MSL1 CYV15G0101EQ (7C9150A) STRESS: INPUT CAPACITANCE CYV15G0101EQ (7C9150A) STRESS: ESD-CHARGE DEVICE MODEL (500V) CYV15G0101EQ (7C9150A) 9601691 STRESS: ESD-HUMAN BODY CIRCUIT PER JESD22, METHOD A114-E, 2200V CYV15G0101EQ (7C9150A) 9601691 610602074 M-PHIL STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (125C, 3.80V, Vcc Max) CYV15G0101EQ (7C9150A) 9601691 610602074L2A M-PHIL 96 340 0 CYV15G0101EQ (7C9150A) 9601691 610628136 M-PHIL 96 353 0 CYV15G0101EQ (7C9150A) 9601691 610659024 M-PHIL 96 500 0 STRESS: HIGH TEMPERATURE STORAGE, 150C, no bias CYV15G0101EQ (7C9150A) 9601691 610602074L1A M-PHIL 552 50 0 CYV15G0101EQ (7C9150A) 9601691 610544032 1000 50 0 M-PHIL STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (125C, 3.80V, Vcc Max) CYV15G0101EQ (7C9150A) 9601691 610602074L2A M-PHIL 1000 169 0 CYV15G0101EQ (7C9150A) 9601691 610628136 168 351 0 M-PHIL STRESS: LOW TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (-30C, 3.80V, Vcc Max) CYV15G0101EQ (7C9150A) 9601691 610602074L2A M-PHIL 500 48 0 STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 psig, PRE COND 168HR, 85C/85%RH, MSL1 CYV15G0101EQ (7C9150A) 9601691 610602074L1A M-PHIL 168 50 0 COMP 3 0 500 50 0 STRESS: STATIC LATCH-UP TESTING (125C, 6.5V, ±200mA) CYV15G0101EQ (7C9150A) 9601691 610602074 M-PHIL STRESS: TC COND. C -65C TO 150C, PRE COND 168 HRS, 85C/85%RH, MSL1 CYV15G0101EQ (7C9150A) 9601691 610602074L1A M-PHIL Failure Mechanism Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 8 of 9 April 2008 Reliability Test Data QTP #: Device 063804 Fab Lot # Assy Lot # Assy Loc Duration Samp Rej 9623717 610642883Q T-TWN COMP 15 0 610642883Q T-TWN COMP 9 0 COMP 6 0 STRESS: ACOUSTIC-MSL1 CYV15G0100EQ (7C9150C) STRESS: ESD-CHARGE DEVICE MODEL (500V) CYV15G0100EQ (7C9150C) 9623717 STRESS: ESD-HUMAN BODY CIRCUIT PER JESD22, METHOD A114-E, 2200V CYV15G0100EQ (7C9150C) 9623717 610642883Q T-TWN STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (125C, 3.80V, Vcc Max) CYV15G0100EQ (7C9150C) 9623717 610642883Q T-TWN 96 354 0 CYV15G0100EQ (7C9150C) 9623717 610659948 T-TWN 96 738 0 CYV15G0100EQ (7C9150C) 9623717 6106662062 T-TWN 96 380 0 STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (125C, 3.80V, Vcc Max) CYV15G0100EQ (7C9150C) 9623717 610642883Q T-TWN 500 192 0 CYV15G0100EQ (7C9150C) 9623717 610659948 T-TWN 168 738 0 CYV15G0100EQ (7C9150C) 9623717 6106662062 T-TWN 168 380 0 STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 psig, PRE COND 168HR, 85C/85%RH, MSL1 CYV15G0100EQ (7C9150C) 9623717 610642883Q T-TWN 168 T-TWN COMP 46 0 2 0 45 0 STRESS: STATIC LATCH-UP TESTING (125C, ±300mA) CYV15G0100EQ (7C9150C) 9623717 610642883Q STRESS: TC COND. C -65C TO 150C, PRE COND 168 HRS, 85C/85%RH, MSL1 CYV15G0100EQ (7C9150C) 9623717 610642883Q T-TWN 500 Failure Mechanism Cypress Semiconductor Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ* 071603 V.1.1 Page 9 of 9 April 2008 Reliability Test Data QTP #: Device 071603 Fab Lot # Assy Lot # Assy Loc Duration Samp Rej 8721009 610728840 T-TWN COMP 15 0 610728840 T-TWN COMP 9 0 COMP 8 0 STRESS: ACOUSTIC-MSL1 CYV15G0100EQ (7C9150E) STRESS: ESD-CHARGE DEVICE MODEL (500V) CYV15G0100EQ (7C9150E) 8721009 STRESS: ESD-HUMAN BODY CIRCUIT PER JESD22, METHOD A114-E, 2200V CYV15G0100EQ (7C9150E) 8721009 610728840 T-TWN STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (125C, 3.80V, Vcc Max) CYV15G0100EQ (7C9150E) 8721009 610732977 T-TWN 96 379 0 CYV15G0100EQ (7C9150E) 8721009 610728840 T-TWN 96 384 0 CYV15G0100EQ (7C9150E) 8721009 610730038 T-TWN 96 376 0 STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (125C, 3.80V, Vcc Max) CYV15G0100EQ (7C9150E) 8721009 610732977 T-TWN 168 379 0 CYV15G0100EQ (7C9150E) 8721009 610728840 T-TWN 1024 380 0 CYV15G0100EQ (7C9150E) 8721009 610730038 T-TWN 168 376 0 STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 psig, PRE COND 168HR, 85C/85%RH, MSL1 CYV15G0100EQ (7C9150E) 8721009 610728840 T-TWN 168 T-TWN COMP 77 0 3 0 77 0 STRESS: STATIC LATCH-UP TESTING (125C, 5.4V, ±200mA) CYV15G0100EQ (7C9150E) 8721009 610728840 STRESS: TC COND. C -65C TO 150C, PRE COND 168 HRS, 85C/85%RH, MSL1 CYV15G0100EQ (7C9150E) 8721009 610728840 T-TWN 500 Failure Mechanism