071603 Rev1.1.pdf

Cypress Semiconductor
Product Qualification Report
QTP# 071603 VERSION 1.1
April 2008
Video Cable Equalizer Family
0.18um Mixed Mode/RFCMOS Technology
Fab8C, UMC-Taiwan
CYV15G0101EQ*
CYV15G0104EQ*
3.3V Multi-Rate Video Cable Equalizer
CYV15G0100EQ*
CYV15G0103EQ*
3.3V Prosumer Video Cable Equalizer
CYV270M0101EQ*
CYV270M0104EQ*
3.3V Adaptive Video Cable Equalizer
CYPRESS TECHNICAL CONTACT FOR QUALIFICATION DATA:
Rene Rodgers
Principal Reliability Engineer
(408) 432-2732
Mira Ben-Tzur
Quality Engineering Director
(408) 943-2675
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 2 of 9
April 2008
PRODUCT QUALIFICATION HISTORY
Qual
Report
Description of Qualification Purpose
Date
Comp
060803
New Device Equalizer 7C9150A in UMC Fab8C, 0.18um 1P6M Mixed Mode/RF Process
Feb 2007
063804
7C9150 Video Equalizer Rev C
Feb 2007
071603
7C9150E Video Cable Equalizer in 0.18um Mixed Mode RFCMOS Technology, UMC-Taiwan Fab8C
Sep 2007
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 3 of 9
April 2008
PRODUCT DESCRIPTION (for qualification)
Purpose: Qualify 7C9150 Video Cable Equalizer Device in 0.18um Mixed Mode RFCMOS Technology at UMC-Taiwan,
Fab8C
Marketing Part #:
CYV15G0100EQ*, CYV15G0101EQ*, CYV15G0103EQ*, CYV15G0104EQ*,
CYV270M0101EQ*, CYV270M0104EQ*
Device Description:
3.3V Video Cable Equalizer
Cypress Division:
Data Communications Division
Number of Metal Layers:
TECHNOLOGY/FAB PROCESS DESCRIPTION
Metal 1: 150Å Ti / 200Å TiN / 4,000Å Al-Cu / 150Å Ti / 300Å TiN
Metal
Composition: Metal 2: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN
Metal 3: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN
Metal 4: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN
Metal 5: 150Å Ti / 200Å TiN / 5,000Å Al-Cu / 150Å Ti / 300Å TiN
Metal 6: 150Å Ti / 200Å TiN / 8,000Å Al-Cu / 150Å Ti / 300Å TiN
SiO2 7,000Å, SiO2 5,000Å , Si3Ni4 10,000Å
6
Passivation Type and Materials:
Generic Process Technology/Design Rule (µdrawn):
CMOS / 0.18um
Gate Oxide Material/Thickness (MOS):
Name/Location of Die Fab (prime) Facility:
SiO2 ,42 Å (1.8V)
SiO2 ,70 Å (3.3V)
UMC / Taiwan
Die Fab Line ID/Wafer Process ID:
Fab8C, Mixed Mode RF
PACKAGE AVAILABILITY
PACKAGE
16-Lead SOIC
ASSEMBLY SITE FACILITY
OSE-TAIWAN (T)
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION
Package Designation:
Package Outline, Type, or Name:
Mold Compound Name/Manufacturer:
Mold Compound Flammability Rating:
SZ16
16-Lead Small Outline Integrated Circuit (SOIC)
Cel9220THF
V-0 per UL94
Oxygen Rating Index:
N/A
Lead Frame Material:
Copper
Lead Finish, Composition / Thickness:
NiPdAu
Die Backside Preparation Method/Metallization:
Backgrind
Die Separation Method:
Saw
Die Attach Supplier/Material:
Hitachi EN4900G
Die Attach Method:
Epoxy
Bond Diagram Designation:
001-08878
Wire Bond Method:
Thermosonic
Wire Material/Size:
Au 1.0mil
Thermal Resistance Theta JA °C/W:
126
Package Cross Section Yes/No:
N/A
Assembly Process Flow:
49-35044
Name/Location of Assembly (prime) facility:
OSE / Taiwan
MSL Level
1
Reflow Profile
260
ELECTRICAL TEST / FINISH DESCRIPTION
Test Location:
CML-R
071603 V.1.1
Page 4 of 9
April 2008
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 5 of 9
April 2008
RELIABILITY TESTS PERFORMED PER SPECIFICATION REQUIREMENT
Stress/Test
High Temperature Operating Life
Test Condition
(Temp/Bias)
Dynamic Operating Condition, Vcc Max=3.80V, 125°C
Result
P/F
P
Early Failure Rate
High Temperature Operating Life
Dynamic Operating Condition, Vcc Max=3.80V, 125°C
P
Low Temperature Operating Life
Dynamic Operating Condition, Vcc Max=3.80V, -30°C
P
Temperature Cycle
JESD22, Method 104C, Condition C, -65°C to 150°C
Precondition: JESD22 Moisture Sensitivity Level 1
P
Latent Failure Rate
168 Hrs, 85C/85%RH+3IR-Reflow, 260°C+0, -5°C
Pressure Cooker
121°C, 100%RH, 15 Psig
Precondition: JESD22 Moisture Sensitivity Level 1
168 Hrs, 85C/85%RH+3IR-Reflow, 260 C+0, -5°C
Electrostatic Discharge
Human Body Model (ESD-HBM)
2200V
JESD22, Method A114-E
P
Electrostatic Discharge
Charge Device Model (ESD-CDM)
500V
Cypress Spec. 25-00020
P
Acoustic Microscopy
Spec. 25-00104
P
High Temperature Storage
150C, no bias
P
Latch up Sensitivity
125C, ± 200mA / ± 300mA
Cypress Spec. 01-00081
P
P
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 6 of 9
April 2008
RELIABILITY FAILURE RATE SUMMARY
Stress/Test
High Temperature Operating Life
Early Failure Rate1
High Temperature Operating Life1,2
Long Term Failure Rate
1
2
3
Device Tested/
Device Hours
#
Fails
Activation
Energy
Thermal3
A.F
Failure
Rate
3804
0
N/A
N/A
0 PPM
1,026,752
0
0 .7
55
17 FITs
Assuming an ambient temperature of 55°C and a junction temperature rise of 15°C.
Chi-squared 60% estimations used to calculate the failure rate.F
Thermal Acceleration Factor is calculated from the Arrhenius equation
⎡E ⎡ 1 1 ⎤ ⎤
AF = exp ⎢ A ⎢ - ⎥ ⎥
⎣ k ⎣ T 2 T1 ⎦ ⎦
where:
EA =The Activation Energy of the defect mechanism.
k = Boltzmann's constant = 8.62x10-5 eV/Kelvin.
T1 is the junction temperature of the device under stress and T2 is the junction temperature of the device
at use conditions.
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 7 of 9
April 2008
Reliability Test Data
QTP #:
Device
060803
Fab Lot #
Assy Lot #
Assy Loc
9601691
610602074
M-PHIL
9601691
610628136
610602074
Duration
Samp
Rej
COMP
26
0
M-PHIL
COMP
3
0
M-PHIL
COMP
9
0
COMP
9
0
STRESS: ACOUSTIC-MSL1
CYV15G0101EQ (7C9150A)
STRESS: INPUT CAPACITANCE
CYV15G0101EQ (7C9150A)
STRESS: ESD-CHARGE DEVICE MODEL (500V)
CYV15G0101EQ (7C9150A)
9601691
STRESS: ESD-HUMAN BODY CIRCUIT PER JESD22, METHOD A114-E, 2200V
CYV15G0101EQ (7C9150A)
9601691
610602074
M-PHIL
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (125C, 3.80V, Vcc Max)
CYV15G0101EQ (7C9150A)
9601691
610602074L2A M-PHIL
96
340
0
CYV15G0101EQ (7C9150A)
9601691
610628136
M-PHIL
96
353
0
CYV15G0101EQ (7C9150A)
9601691
610659024
M-PHIL
96
500
0
STRESS: HIGH TEMPERATURE STORAGE, 150C, no bias
CYV15G0101EQ (7C9150A)
9601691
610602074L1A M-PHIL
552
50
0
CYV15G0101EQ (7C9150A)
9601691
610544032
1000
50
0
M-PHIL
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (125C, 3.80V, Vcc Max)
CYV15G0101EQ (7C9150A)
9601691
610602074L2A M-PHIL
1000
169
0
CYV15G0101EQ (7C9150A)
9601691
610628136
168
351
0
M-PHIL
STRESS: LOW TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (-30C, 3.80V, Vcc Max)
CYV15G0101EQ (7C9150A)
9601691
610602074L2A M-PHIL
500
48
0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 psig, PRE COND 168HR, 85C/85%RH, MSL1
CYV15G0101EQ (7C9150A)
9601691
610602074L1A M-PHIL
168
50
0
COMP
3
0
500
50
0
STRESS: STATIC LATCH-UP TESTING (125C, 6.5V, ±200mA)
CYV15G0101EQ (7C9150A)
9601691
610602074
M-PHIL
STRESS: TC COND. C -65C TO 150C, PRE COND 168 HRS, 85C/85%RH, MSL1
CYV15G0101EQ (7C9150A)
9601691
610602074L1A M-PHIL
Failure Mechanism
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 8 of 9
April 2008
Reliability Test Data
QTP #:
Device
063804
Fab Lot #
Assy Lot #
Assy Loc
Duration
Samp
Rej
9623717
610642883Q
T-TWN
COMP
15
0
610642883Q
T-TWN
COMP
9
0
COMP
6
0
STRESS: ACOUSTIC-MSL1
CYV15G0100EQ (7C9150C)
STRESS: ESD-CHARGE DEVICE MODEL (500V)
CYV15G0100EQ (7C9150C)
9623717
STRESS: ESD-HUMAN BODY CIRCUIT PER JESD22, METHOD A114-E, 2200V
CYV15G0100EQ (7C9150C)
9623717
610642883Q
T-TWN
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (125C, 3.80V, Vcc Max)
CYV15G0100EQ (7C9150C)
9623717
610642883Q
T-TWN
96
354
0
CYV15G0100EQ (7C9150C)
9623717
610659948
T-TWN
96
738
0
CYV15G0100EQ (7C9150C)
9623717
6106662062
T-TWN
96
380
0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (125C, 3.80V, Vcc Max)
CYV15G0100EQ (7C9150C)
9623717
610642883Q
T-TWN
500
192
0
CYV15G0100EQ (7C9150C)
9623717
610659948
T-TWN
168
738
0
CYV15G0100EQ (7C9150C)
9623717
6106662062
T-TWN
168
380
0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 psig, PRE COND 168HR, 85C/85%RH, MSL1
CYV15G0100EQ (7C9150C)
9623717
610642883Q
T-TWN
168
T-TWN
COMP
46
0
2
0
45
0
STRESS: STATIC LATCH-UP TESTING (125C, ±300mA)
CYV15G0100EQ (7C9150C)
9623717
610642883Q
STRESS: TC COND. C -65C TO 150C, PRE COND 168 HRS, 85C/85%RH, MSL1
CYV15G0100EQ (7C9150C)
9623717
610642883Q
T-TWN
500
Failure Mechanism
Cypress Semiconductor
Video Cable Equalizer, 0.18um Mixed Mode RFCMOS, Fab8C
Device: CYV15G0100/3EQ*, CYV15G0101/4EQ*, CYV270M0101/4EQ*
071603 V.1.1
Page 9 of 9
April 2008
Reliability Test Data
QTP #:
Device
071603
Fab Lot #
Assy Lot #
Assy Loc
Duration
Samp
Rej
8721009
610728840
T-TWN
COMP
15
0
610728840
T-TWN
COMP
9
0
COMP
8
0
STRESS: ACOUSTIC-MSL1
CYV15G0100EQ (7C9150E)
STRESS: ESD-CHARGE DEVICE MODEL (500V)
CYV15G0100EQ (7C9150E)
8721009
STRESS: ESD-HUMAN BODY CIRCUIT PER JESD22, METHOD A114-E, 2200V
CYV15G0100EQ (7C9150E)
8721009
610728840
T-TWN
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (125C, 3.80V, Vcc Max)
CYV15G0100EQ (7C9150E)
8721009
610732977
T-TWN
96
379
0
CYV15G0100EQ (7C9150E)
8721009
610728840
T-TWN
96
384
0
CYV15G0100EQ (7C9150E)
8721009
610730038
T-TWN
96
376
0
STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (125C, 3.80V, Vcc Max)
CYV15G0100EQ (7C9150E)
8721009
610732977
T-TWN
168
379
0
CYV15G0100EQ (7C9150E)
8721009
610728840
T-TWN
1024
380
0
CYV15G0100EQ (7C9150E)
8721009
610730038
T-TWN
168
376
0
STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 psig, PRE COND 168HR, 85C/85%RH, MSL1
CYV15G0100EQ (7C9150E)
8721009
610728840
T-TWN
168
T-TWN
COMP
77
0
3
0
77
0
STRESS: STATIC LATCH-UP TESTING (125C, 5.4V, ±200mA)
CYV15G0100EQ (7C9150E)
8721009
610728840
STRESS: TC COND. C -65C TO 150C, PRE COND 168 HRS, 85C/85%RH, MSL1
CYV15G0100EQ (7C9150E)
8721009
610728840
T-TWN
500
Failure Mechanism
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